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Title: Effect of Surface Termination on the Electonic Properties of LaNiO₃ Films

Abstract

The electronic and structural properties of thin LaNiO₃ films grown by using molecular beam epitaxy are studied as a function of the net ionic charge of the surface terminating layer. We demonstrate that electronic transport in nickelate heterostructures can be manipulated through changes in the surface termination due to a strong coupling of the surface electrostatic properties to the structural properties of the Ni—O bonds that govern electronic conduction. We observe experimentally and from first-principles theory an asymmetric response of the structural properties of the films to the sign of the surface charge, which results from a strong interplay between electrostatic and mechanical boundary conditions governing the system. The structural response results in ionic buckling in the near-surface NiO₂ planes for films terminated with negatively charged NiO₂ and bulklike NiO₂ planes for films terminated with positively charged LaO planes. The ability to modify transport properties by the deposition of a single atomic layer can be used as a guiding principle for nanoscale device fabrication.

Authors:
 [1];  [1];  [1];  [2];  [1];  [1];  [3]
  1. Yale Univ., Center for Research on Interface Structures and Phenomena and Department of Applied Physics, New Haven, CT (United States)
  2. Brookhaven National Laboratory, National Synchrotron Light Source, Upton, NY (United States)
  3. Yale Univ., Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Department of Mechanical Engineering and Materials Science, New Haven, CT (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1165968
Alternate Identifier(s):
OSTI ID: 1179980
Report Number(s):
BNL-107214-2014-JA
Journal ID: ISSN 2331-7019; PRAHB2; R&D Project: LS001
Grant/Contract Number:  
AC02-98CH10886; AC02–06CH11357; AC02–98CH10886
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Applied
Additional Journal Information:
Journal Volume: 2; Journal Issue: 5; Journal ID: ISSN 2331-7019
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Kumah, Divine P., Malashevich, Andrei, Disa, Ankit S., Arena, Dario A., Walker, Fred J., Ismail-Beigi, Sohrab, and Ahn, Charles H. Effect of Surface Termination on the Electonic Properties of LaNiO₃ Films. United States: N. p., 2014. Web. doi:10.1103/PhysRevApplied.2.054004.
Kumah, Divine P., Malashevich, Andrei, Disa, Ankit S., Arena, Dario A., Walker, Fred J., Ismail-Beigi, Sohrab, & Ahn, Charles H. Effect of Surface Termination on the Electonic Properties of LaNiO₃ Films. United States. https://doi.org/10.1103/PhysRevApplied.2.054004
Kumah, Divine P., Malashevich, Andrei, Disa, Ankit S., Arena, Dario A., Walker, Fred J., Ismail-Beigi, Sohrab, and Ahn, Charles H. Thu . "Effect of Surface Termination on the Electonic Properties of LaNiO₃ Films". United States. https://doi.org/10.1103/PhysRevApplied.2.054004. https://www.osti.gov/servlets/purl/1165968.
@article{osti_1165968,
title = {Effect of Surface Termination on the Electonic Properties of LaNiO₃ Films},
author = {Kumah, Divine P. and Malashevich, Andrei and Disa, Ankit S. and Arena, Dario A. and Walker, Fred J. and Ismail-Beigi, Sohrab and Ahn, Charles H.},
abstractNote = {The electronic and structural properties of thin LaNiO₃ films grown by using molecular beam epitaxy are studied as a function of the net ionic charge of the surface terminating layer. We demonstrate that electronic transport in nickelate heterostructures can be manipulated through changes in the surface termination due to a strong coupling of the surface electrostatic properties to the structural properties of the Ni—O bonds that govern electronic conduction. We observe experimentally and from first-principles theory an asymmetric response of the structural properties of the films to the sign of the surface charge, which results from a strong interplay between electrostatic and mechanical boundary conditions governing the system. The structural response results in ionic buckling in the near-surface NiO₂ planes for films terminated with negatively charged NiO₂ and bulklike NiO₂ planes for films terminated with positively charged LaO planes. The ability to modify transport properties by the deposition of a single atomic layer can be used as a guiding principle for nanoscale device fabrication.},
doi = {10.1103/PhysRevApplied.2.054004},
journal = {Physical Review Applied},
number = 5,
volume = 2,
place = {United States},
year = {Thu Nov 06 00:00:00 EST 2014},
month = {Thu Nov 06 00:00:00 EST 2014}
}

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