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Title: X-ray diffraction studies of trilayer oscillations in the preferred thickness of In films on Si(111)

Authors:
; ; ;
Publication Date:
OSTI Identifier:
1102232
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 87; Journal Issue: 19; Journal ID: ISSN 1098-0121
Publisher:
American Physical Society
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English