Electronic correlation strength of Pu

Svane, A.; Albers, R. C.; Christensen, N. E.; van Schilfgaarde, M.; Chantis, A. N.; Zhu, Jian-Xin

doi:10.1103/PhysRevB.87.045109

Title: Electronic correlation strength of Pu

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Authors:: Svane, A.; Albers, R. C.; Christensen, N. E.; van Schilfgaarde, M.; Chantis, A. N.; Zhu, Jian-Xin

Publication Date:: Thu Jan 10 00:00:00 EST 2013

Sponsoring Org.:: USDOE

OSTI Identifier:: 1101875

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Physical Review B

Additional Journal Information:: Journal Volume: 87; Journal Issue: 4; Journal ID: ISSN 1098-0121

Publisher:: American Physical Society

Country of Publication:: United States

Language:: English

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                    Svane, A., Albers, R. C., Christensen, N. E., van Schilfgaarde, M., Chantis, A. N., and Zhu, Jian-Xin. Electronic correlation strength of Pu.  United States: N. p., 2013. 
Web.  doi:10.1103/PhysRevB.87.045109.

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                    Svane, A., Albers, R. C., Christensen, N. E., van Schilfgaarde, M., Chantis, A. N., & Zhu, Jian-Xin. Electronic correlation strength of Pu.  United States.  https://doi.org/10.1103/PhysRevB.87.045109

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                    Svane, A., Albers, R. C., Christensen, N. E., van Schilfgaarde, M., Chantis, A. N., and Zhu, Jian-Xin. Thu .  
"Electronic correlation strength of Pu".  United States.  https://doi.org/10.1103/PhysRevB.87.045109.

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@article{osti_1101875,

  title        = {Electronic correlation strength of Pu},

  author       = {Svane, A. and Albers, R. C. and Christensen, N. E. and van Schilfgaarde, M. and Chantis, A. N. and Zhu, Jian-Xin},

  abstractNote = {},

  doi          = {10.1103/PhysRevB.87.045109},

  journal      = {Physical Review B},

  number       = 4,

  volume       = 87,

  place        = {United States},

  year         = {Thu Jan 10 00:00:00 EST 2013},

  month        = {Thu Jan 10 00:00:00 EST 2013}

}

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