Effect of charged dislocation scattering on electrical and electrothermal transport in n -type InN

Miller, Nate; Haller, Eugene E.; Koblmüller, Gregor; Gallinat, Chad; Speck, James S.; Schaff, William J.; Hawkridge, Michael E.; Yu, Kin Man; Ager, Joel W.

doi:10.1103/PhysRevB.84.075315

Title: Effect of charged dislocation scattering on electrical and electrothermal transport in $n$ -type InN

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Authors:: Miller, Nate; Haller, Eugene E.; Koblmüller, Gregor; Gallinat, Chad; Speck, James S.; Schaff, William J.; Hawkridge, Michael E.; Yu, Kin Man; Ager, Joel W.

Publication Date:: Tue Aug 09 00:00:00 EDT 2011

Sponsoring Org.:: USDOE

OSTI Identifier:: 1100518

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Physical Review B

Additional Journal Information:: Journal Volume: 84; Journal Issue: 7; Journal ID: ISSN 1098-0121

Publisher:: American Physical Society

Country of Publication:: United States

Language:: English

Citation Formats


                    Miller, Nate, Haller, Eugene E., Koblmüller, Gregor, Gallinat, Chad, Speck, James S., Schaff, William J., Hawkridge, Michael E., Yu, Kin Man, and Ager, Joel W. Effect of charged dislocation scattering on electrical and electrothermal transport in n -type InN.  United States: N. p., 2011. 
Web.  doi:10.1103/PhysRevB.84.075315.

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                    Miller, Nate, Haller, Eugene E., Koblmüller, Gregor, Gallinat, Chad, Speck, James S., Schaff, William J., Hawkridge, Michael E., Yu, Kin Man, & Ager, Joel W. Effect of charged dislocation scattering on electrical and electrothermal transport in n -type InN.  United States.  https://doi.org/10.1103/PhysRevB.84.075315

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                    Miller, Nate, Haller, Eugene E., Koblmüller, Gregor, Gallinat, Chad, Speck, James S., Schaff, William J., Hawkridge, Michael E., Yu, Kin Man, and Ager, Joel W. Tue .  
"Effect of charged dislocation scattering on electrical and electrothermal transport in n -type InN".  United States.  https://doi.org/10.1103/PhysRevB.84.075315.

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@article{osti_1100518,

  title        = {Effect of charged dislocation scattering on electrical and electrothermal transport in n -type InN},

  author       = {Miller, Nate and Haller, Eugene E. and Koblmüller, Gregor and Gallinat, Chad and Speck, James S. and Schaff, William J. and Hawkridge, Michael E. and Yu, Kin Man and Ager, Joel W.},

  abstractNote = {},

  doi          = {10.1103/PhysRevB.84.075315},

  journal      = {Physical Review B},

  number       = 7,

  volume       = 84,

  place        = {United States},

  year         = {Tue Aug 09 00:00:00 EDT 2011},

  month        = {Tue Aug 09 00:00:00 EDT 2011}

}

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Journal Article:

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Accepted Manuscript (Publisher)

Publisher's Version of Record
https://doi.org/10.1103/PhysRevB.84.075315

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Title: Effect of charged dislocation scattering on electrical and electrothermal transport in n -type InN

Citation Formats

Title: Effect of charged dislocation scattering on electrical and electrothermal transport in $n$ -type InN