Defect-induced resonances and magnetic patterns in graphene

Chang, Yi Chen; Haas, Stephan

doi:10.1103/PhysRevB.83.085406

Title: Defect-induced resonances and magnetic patterns in graphene

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Authors:: Chang, Yi Chen; Haas, Stephan

Publication Date:: Fri Feb 11 00:00:00 EST 2011

Sponsoring Org.:: USDOE

OSTI Identifier:: 1099844

Resource Type:: Publisher's Accepted Manuscript

Journal Name:: Physical Review B

Additional Journal Information:: Journal Volume: 83; Journal Issue: 8; Journal ID: ISSN 1098-0121

Publisher:: American Physical Society

Country of Publication:: United States

Language:: English

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                    Chang, Yi Chen, and Haas, Stephan. Defect-induced resonances and magnetic patterns in graphene.  United States: N. p., 2011. 
Web.  doi:10.1103/PhysRevB.83.085406.

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                    Chang, Yi Chen, & Haas, Stephan. Defect-induced resonances and magnetic patterns in graphene.  United States.  https://doi.org/10.1103/PhysRevB.83.085406

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                    Chang, Yi Chen, and Haas, Stephan. Fri .  
"Defect-induced resonances and magnetic patterns in graphene".  United States.  https://doi.org/10.1103/PhysRevB.83.085406.

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@article{osti_1099844,

  title        = {Defect-induced resonances and magnetic patterns in graphene},

  author       = {Chang, Yi Chen and Haas, Stephan},

  abstractNote = {},

  doi          = {10.1103/PhysRevB.83.085406},

  journal      = {Physical Review B},

  number       = 8,

  volume       = 83,

  place        = {United States},

  year         = {Fri Feb 11 00:00:00 EST 2011},

  month        = {Fri Feb 11 00:00:00 EST 2011}

}

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