Determination of Gap Symmetry from Angle-Dependent Hc2 Measurements on CeCu2Si2
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1099419
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Physical Review Letters
- Additional Journal Information:
- Journal Name: Physical Review Letters Journal Volume: 106 Journal Issue: 20; Journal ID: ISSN 0031-9007
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Vieyra, H. A., Oeschler, N., Seiro, S., Jeevan, H. S., Geibel, C., Parker, D., and Steglich, F. Determination of Gap Symmetry from Angle-Dependent Hc2 Measurements on CeCu2Si2. United States: N. p., 2011.
Web. doi:10.1103/PhysRevLett.106.207001.
Vieyra, H. A., Oeschler, N., Seiro, S., Jeevan, H. S., Geibel, C., Parker, D., & Steglich, F. Determination of Gap Symmetry from Angle-Dependent Hc2 Measurements on CeCu2Si2. United States. https://doi.org/10.1103/PhysRevLett.106.207001
Vieyra, H. A., Oeschler, N., Seiro, S., Jeevan, H. S., Geibel, C., Parker, D., and Steglich, F. Fri .
"Determination of Gap Symmetry from Angle-Dependent Hc2 Measurements on CeCu2Si2". United States. https://doi.org/10.1103/PhysRevLett.106.207001.
@article{osti_1099419,
title = {Determination of Gap Symmetry from Angle-Dependent Hc2 Measurements on CeCu2Si2},
author = {Vieyra, H. A. and Oeschler, N. and Seiro, S. and Jeevan, H. S. and Geibel, C. and Parker, D. and Steglich, F.},
abstractNote = {},
doi = {10.1103/PhysRevLett.106.207001},
journal = {Physical Review Letters},
number = 20,
volume = 106,
place = {United States},
year = {Fri May 20 00:00:00 EDT 2011},
month = {Fri May 20 00:00:00 EDT 2011}
}
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https://doi.org/10.1103/PhysRevLett.106.207001
https://doi.org/10.1103/PhysRevLett.106.207001
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Cited by: 37 works
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