Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications

Beringer, D. B.; Roach, W. M.; Clavero, C.; Reece, C. E.; Lukaszew, R. A.

doi:10.1103/PhysRevSTAB.16.022001

Title: Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications

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Authors:: Beringer, D. B.; Roach, W. M.; Clavero, C.; Reece, C. E.; Lukaszew, R. A.

Publication Date:: Tue Feb 05 00:00:00 EST 2013

Sponsoring Org.:: USDOE

OSTI Identifier:: 1074674

Resource Type:: Published Article

Journal Name:: Physical Review Special Topics - Accelerators and Beams

Additional Journal Information:: Journal Volume: 16; Journal Issue: 2; Journal ID: ISSN 1098-4402

Publisher:: American Physical Society

Country of Publication:: United States

Language:: English

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                    Beringer, D. B., Roach, W. M., Clavero, C., Reece, C. E., and Lukaszew, R. A. Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications.  United States: N. p., 2013. 
Web.  doi:10.1103/PhysRevSTAB.16.022001.

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                    Beringer, D. B., Roach, W. M., Clavero, C., Reece, C. E., & Lukaszew, R. A. Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications.  United States.  https://doi.org/10.1103/PhysRevSTAB.16.022001

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                    Beringer, D. B., Roach, W. M., Clavero, C., Reece, C. E., and Lukaszew, R. A. Tue .  
"Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications".  United States.  https://doi.org/10.1103/PhysRevSTAB.16.022001.

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@article{osti_1074674,

  title        = {Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications},

  author       = {Beringer, D. B. and Roach, W. M. and Clavero, C. and Reece, C. E. and Lukaszew, R. A.},

  abstractNote = {},

  doi          = {10.1103/PhysRevSTAB.16.022001},

  journal      = {Physical Review Special Topics - Accelerators and Beams},

  number       = 2,

  volume       = 16,

  place        = {United States},

  year         = {Tue Feb 05 00:00:00 EST 2013},

  month        = {Tue Feb 05 00:00:00 EST 2013}

}

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Roughness analysis applied to niobium thin films grown on MgO(001) surfaces for superconducting radio frequency cavity applications

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