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Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


1

NCEM National Center for Electron Microscopy: Becoming an NCEM User  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

New Research New Research Gallery Microscopy Links Becoming an NCEM User Step 1: Submit a proposal Step 2: Before you begin your research Step 3: Instrument qualification Step 4: Accessing NCEM facilities and performing research Step 1: Submit a proposal Deadlines for new proposals are March 15, June 15, September 15, December 15. Access to NCEM facilities is granted to researchers whose proposals are accepted by the NCEM proposal review committee. NCEM users are expected to have a strong background in transmission electron microscopy, and submitted proposals should include evidence of prior electron microscopy experience by the intended operator. Researchers who do not have sufficient experience in electron microscopy may be able to use NCEM facilities through a collaborative project.

2

NCEM National Center for Electron Microscopy: About NCEM  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

NCEM NCEM The National Center for Electron Microscopy (NCEM) is one of the world's foremost centers for electron microscopy and microcharacterization. It is an Office of Science User Facility operated for the U.S. Department of Energy by Lawrence Berkeley National Laboratory. Located adjacent to the University of California, Berkeley, NCEM was established in 1983 to maintain a forefront research center for electron-optical characterization of materials with state-of-the-art instrumentation and expertise. As a national user facility, NCEM is open to scientists from universities, government and industrial laboratories. The center provides cutting-edge instrumentation, techniques and expertise for advanced electron beam microcharacterization of materials at high spatial

3

NCEM National Center for Electron Microscopy: Staff  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Staff Staff Scientific Technical / Admin. Postdoctoral and Visitors Uli Dahmen, Head Jane Cavlina / Administrator Abhay Gautam Christian Kisielowski John Turner Helmut Poppa Andrew Minor ChengYu Song Frances Allen Andreas Schmid Marissa Libbee Tamara Radetic Peter Ercius Karen Bustillo Haimei Zheng Jim Ciston Alpha N'Diaye Colin Ophus Gong Chen Burak Ozdol Velimir Radmilovic Sara Kiani Hua Guo Christian Liebscher Josh Kacher Chris Nelson Xiuguang Jin Qian Yu Mary Scott Search the LBNL directory services page for other LBNL staff. Scientific Staff Uli Dahmen udahmen@lbl.gov (510) 486-4627 Ulrich Dahmen is Director of the National Center for Electron Microscopy. His current research interests include embedded nanostructures and interfaces in materials. Embedded nanostructures. Size- and shape-dependence of structural phase

4

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Specimen Preparation Specimen Preparation Preparation of samples with large transparent areas and flat surfaces is a key element of electron microscopy. In particular, the interpretation of lattice or holographic images is often limited by the sample's geometry and surface roughness. These parameters are largely determined by a particular sample preparation procedure. The increasing demand for microscopes with a spatial resolution of better than 1Å increases the need for improved sample preparation techniques. A substantial effort at NCEM is devoted to the development of reliable and specialized thinning techniques. Current programs explore the application of chemicals to shape the surfaces of thin films, the use of nanospheres for observation of small particles, and the

5

NCEM National Center for Electron Microscopy: Heating holder guidelines  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Heating holder guidelines Heating holder guidelines If you plan to use heating holders for in-situ experiments, we require your careful review and compliance with the following guidelines. 1. Include in your proposal target temperature and all phase diagrams of material with those of the tantalum furnaces and tantalum and/or molybdenum washers. Eutectic melting or bonding to the furnace body can occur at much lower temperatures than expected. 2. Holders are individually marked with the maximum temperature displayed on the specimen rod. Do not exceed this marked maximum temperature. It is easy to overshoot target temperature, so approach with caution. 3. Pre-schedule time for technical training and assistance by NCEM staff, especially if you are an infrequent or first-time user.

6

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

CM 200 FEG CM 200 FEG AEME The Philips CM200/FEG is a versatile instrument that is designed for analysis of the physical, chemical and magnetic microstructure at high spatial resolution. In addition to high resolution imaging capability, the machine is optimized for analytical electron microscopy and Lorentz imaging, under normal as well as dynamic conditions of variable temperature (77K - 1250K) and applied magnetic fields. Spatially resolved compositional analysis by X-ray emission spectroscopy (Z > 5), local electronic structure measurements by electron energy-loss spectroscopy (Z > 2), convergent beam electron diffraction for three-dimensional structure information, and energy-filtered imaging at the nanometer scale are some of the techniques available on this instrument. In addition, a TEM differential phase

7

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

SPLEEM SPLEEM Publications Imaging Spin Reorientation Transitions in Consecutive Atomic Co layers, Farid El Gabaly, Silvia Gallego, M. Carmen Munoz, Laszlo Szunyogh, Peter Weinberger, Kevin F. McCarty, Christof Klein, Andreas K. Schmid, Juan de la Figuera, submitted Direct imaging of spin-reorientation transitions in ultra-thin Ni films by spin-polarized low-energy electron microscopy, C. Klein, A. K. Schmid, R. Ramchal, and M. Farle, submitted Controlling the kinetic order of spin-reorientation transitions in Ni/Cu(100) films by tuning the substrate step-structure, C. Klein, R. Ramchal, A.K. Schmid, M. Farle, submitted Self-organization and magnetic domain microstructure of Fe nanowire arrays, N. Rougemaille and A.K. Schmid, submitted Self-Assembled Nanofold Network Formation on Layered Crystal Surfaces

8

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

AEM AEM AEME The Analytical Electron Microscope is optimized for elemental microanalysis. The basic instrument is a JEOL 200CX microscope with a side-entry double-tilt goniometer stage and an assortment of specimen holders. This machine can be operated at between 80 and 200 kV in the TEM or STEM mode. Electron energy loss and x-ray signals for elemental microanalysis or spectral imaging can be collected either separately or simultaneously using probe diameters from 6nm to 100nm. Diffraction modes include convergent beam diffraction for three-dimensional structure information and micro-diffraction with a minimum probe size of 20nm. For updates or details, contact Zonghoon Lee or Velimir Radmilovic. The instrument is equipped with two Kevex EDXS detectors and a Gatan PEELS

9

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

0.5 0.5 The TEAM 0.5 microscope is a double-aberration-corrected (scanning) transmission electron microscope (STEM/TEM) capable of producing images with 50 pm resolution. The basic instrument is a modified FEI Titan 80-300 microscope equipped with a special high-brightness Schottky-field emission electron source, a gun monochromator, a high-resolution GIF Tridiem energy-filter, and two CEOS hexapole-type spherical aberration correctors. The illumination aberration corrector corrects coherent axial aberrations up to 4th order, as well as 5th order spherical aberration and six-fold astigmatism. The imaging aberration corrector fully corrects for coherent axial aberrations up to 3rd order and partially compensates for 4th and 5th order aberrations. The microscope has two 2048x2048 slow-scan CCD

10

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

LIBRA LIBRA The 200kV Zeiss monochromated LIBRA 200MC is designed to produce high contrast imaging for TEM and STEM and either convergent beam or parallel beam diffraction using Koehler illumination.In addition, the incorporation of a monochromator into the field emission gun enables energy resolution of ~0.15eV for electron energy loss spectroscopy. The dedicated in-column Omega Filter implemented in this microscope also can be used for both spectroscopic analysis and energy-filtered imaging with a 2048x2048 CCD camera. The high tilt capability of the stage and pole piece accepts various types of analytical holders.This microscope is optimized for soft materials applications that require either the high contrast imaging performance or analytical methods such as EF-TEM and STEM.( Instrument

11

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

3010 In-Situ 3010 In-Situ AEME The 300 kV JEOL 3010 offers greater specimen penetration than 200kV instruments, with significantly improved spatial resolution and probe forming capabilities. The side-entry stage allows ±45° tilt and can be operated with piezo-drift compensation. A flexible condenser system permits CBED, LACBED, and imaging with hollow cone and Koehler illumination. In addition to a standard film camera, a Gatan Orius CCD, and a Gatan 622 intensified TV camera and VCR are available for recording experiments at video rates. Specific capabilities include: high-resolution imaging at 2.1Å and ±40° tilt during simultaneous heating; very-high-resolution imaging at 1.7 Å and ±10° tilt during simultaneous heating; and high magnification Lorentz and Foucault imaging of magnetic samples. Various

12

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Acknowledgment Acknowledgment EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Acknowledgment Please acknowledge your use of the EMC in your publications and presentations with the following acknowledgment statement: The electron microscopy was accomplished at the Electron Microscopy Center at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC.

13

Electron Microscopy Lab  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Facilities » Facilities » Electron Microscopy Lab Electron Microscopy Lab Focusing on the study of microstructures with electron and ion beam instruments, including crystallographic and chemical techniques. April 12, 2012 Transmission electron microscope Rob Dickerson examines a multiphase oxide scale using the FEI Titan 80-300 transmission electron microscope. Contact Rob Dickerson (505) 667-6337 Email Rod McCabe (505) 606-1649 Email Pat Dickerson (505) 665-3036 Email Tom Wynn (505) 665-6861 Email Dedicated to the characterization of materials through imaging, chemical, and crystallographic analyses of material microstructures in support of Basic Energy Science, Laboratory Directed Research and Development, DoD, DOE, Work for Others, nuclear energy, and weapons programs. Go to full website »

14

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

SAMM SAMM EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Sub-Ångstrom Microscopy and Microanalysis Facility In order to meet the scientific challenges of the future, the EMC has built a new state-of-the-art laboratory space for advanced electron microscopy. The new building has been designed to provide next- generation science with an operating environment that cannot be attained by renovating existing facilities. The EMC staff learned as much as possible from similar efforts around the world, including the SuperSTEM building at Daresbury, the Triebenberg Special Laboratory, the AML at Oak Ridge National Laboratory, the new NIST building, and various facilities for nanoscience.

15

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages

Laboratory Laboratory Electron Microscopy Center Argonne Home > EMC > EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

16

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

An Office of Science User Facility An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

17

Dynamic Transmission Electron Microscopy  

SciTech Connect (OSTI)

Dynamic transmission electron microscopy (DTEM) combines the benefits of high spatial resolution electron microscopy with the high temporal resolution of ultrafast lasers. The incorporation of these two components into a single instrument provides a perfect platform for in situ observations of material processes. However, previous DTEM applications have focused on observing structural changes occurring in samples exposed to high vacuum. Therefore, in order to expand the pump-probe experimental regime to more natural environmental conditions, in situ gas and liquid chambers must be coupled with Dynamic TEM. This chapter describes the current and future applications of in situ liquid DTEM to permit time-resolved atomic scale observations in an aqueous environment, Although this chapter focuses mostly on in situ liquid imaging, the same research potential exists for in situ gas experiments and the successful integration of these techniques promises new insights for understanding nanoparticle, catalyst and biological protein dynamics with unprecedented spatiotemporal resolution.

Evans, James E.; Jungjohann, K. L.; Browning, Nigel D.

2012-10-12T23:59:59.000Z

18

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Training Training EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers User Training Prior Training in Electron Microscopy: People who wish to operate TEMs must have at least one college-level course in TEM with a lab component or previous TEM experience. The college course can't be one in which TEM was just one of many topics. For researchers who lack academic training and/or practical experience in electron microscopy, we suggest the short courses in TEM at the Hooke College of Applied Sciences, and the hands-on TEM courses at Northwestern University or the University of Chicago or Northern Illinois University.

19

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Overview Overview The mission of the Electron Microscopy Center (EMC) is to: Conduct materials research using advanced microstructural characterization methods; Maintain unique resources and facilities for scientific research for the both the Argonne National Laboratory and national scientific community. Develop and expand the frontiers of microanalysis by fostering the evolution of synergistic state-of-the-art resources in instrumentation, techniques and scientific expertise; The staff members of the EMC carry out their own research as well as participate in collaborative programs with other scientists at Argonne National Laboratory as well as researchers, educators and students worldwide. The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff perform collaborative research with members of other Divisions at Argonne National Laboratory and with collaborators from universities and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

20

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Submit an EMC Proposal Submit an EMC Proposal EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Submit an EMC Proposal EMC Proposal Submission Deadline Dates for FY2014: November 1, 2013 March 7, 2014 July 11, 2014 Is your proposal a multi-facility proposal? In other words, do you intend to submit proposals to EMC and APS or CNM for your research project? If your answer is "yes," go now to the Proposal Gateway.

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


21

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

EMC Users Committee EMC Users Committee EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers EMC Users Committee An EMC Users Committee has been organized to enhance communication between the user community and the EMC. While the EMC relies on and encourages strong interaction among its users and between its staff and users, the Users Committee provides an additional formal mechanism for user input into EMC planning and operations to ensure that users' needs and concerns are addressed.

22

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

End-of-Proposal Report End-of-Proposal Report EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers End-of-Proposal Report In accordance with the User Agreement, please provide the EMC with the following information when your proposal expires (one year after its acceptance date or when the experiments end, whichever is sooner). A research summary/progress report using these two templates:

23

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Becoming a User Becoming a User EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Procedure to Become a User at the EMC 1. Summary All users have to fulfill certain requirements before access to the EMC can be granted. The following list provides short descriptions of the requirements. Details can be found on this page and via the relevant links at the left. Register for access to Argonne's scientific user facilities (or update your user registration information).

24

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

General Information for EMC Users General Information for EMC Users The Electron Microscopy Center (EMC) is an Office of Science User Facility operated for the U.S. Department of Energy Office of Science by Argonne National Laboratory. It is one of three scientific user facilities for electron beam microcharacterization and one of several National User Facilities located at Argonne National Laboratory. As a scientific user facility, the EMC supports user-accessible instruments (Resources) for high spatial resolution microanalysis, field imaging, nanoscale structural characterization, nanoscale fabrication and manipulation, and unique in situ studies of materials under the influence of ion-beam irradiation. These capabilities are used in a diverse variety of research areas to address grand challenge scientific questions encompassing, for example, energy-related studies, biology, astrophysics, archaeology, superconductivity, nanotechnology, environmental engineering, tribology, and ferroelectricity. The research is performed both by users and by EMC staff. While many users work independently, the most challenging research activities require extensive contributions from EMC staff.

25

Directly correlated transmission electron microscopy and atom...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Directly correlated transmission electron microscopy and atom probe tomography of grain boundary oxidation in a Ni-Al binary Directly correlated transmission electron microscopy...

26

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

iTEAM iTEAM The in situ Transmission Electron Aberration Corrected Microscope (iTEAM) is a proposed project to develop a microscope with powerful capabilities for in situ studies of materials in their native environment. iTEAM will build on the success of the TEAM project by utilizing both spherical and chromatic aberration correction in an electron microscope to provide unprecedented capabilities to study materials in controlled environments of temperature, pressure, or fluidic states with the high-resolution in imaging, diffraction, and spectroscopy typical of electron probes. The capabilities of iTEAM will lead to new ways to understand the behavior of materials in native environments, with particular relevance to major energy initiatives such as catalysis, solar conversion, fuel cells, and batteries. In addition, iTEAM will provide new capabilities to understand organic/inorganic interfaces, functionalized nanoparticles, and biomaterials under natural conditions.

27

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

CM30T TEM CM30T TEM Instrument capabilities: Instrument specifications: Accelerating voltages: 100-300 kV LaB6 emitter Resolution (at 300 kV): ~ 0.25 nm point; ~ 0.14 nm line Minimum probe size: ~ 9 nm Operating modes: CTEM, CBED, SAED, light element XEDS CCD camera: 1 Mp, 14 bits, AVI capture possible at 15 fps Specimen holders: Double Tilt (+/- 60 degrees alpha, +/- 30 degrees beta): with Be cup for XEDS liquid nitrogen cooled (96 K) with Be cup heating (1270 K) Tilt/rotate (+/- 60 degrees alpha, rotation 360 degrees) Single Tilt (+/- 60 degrees alpha) Typical experiments (examples): Quantitative XEDS Morphological and diffraction contrast studies of defects In situ heating & cooling studies Electron crystallography Weak beam studies of defects This page can be downloaded here as an Adobe PDF file.

28

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

FEI Tecnai F20ST TEM/STEM FEI Tecnai F20ST TEM/STEM Instrument capabilities: Instrument specifications: Accelerating voltages: 80-200 kV Schottky FEG emitter Resolution (at 200 kV): ~0.24 nm point; ~0.1 nm line; probe size ~0.2-1 nm Operating modes: CTEM, STEM (BF/ADF, HAADF), CBED, SAED, light element XEDS, EELS, spectrum imaging, energy-filtered imaging (EFI), Lorentz magnetic imaging (LMI), electron holographic imaging (EHI), other computationally-mediated modes. On-axis CCD camera: 16 Mp, 16 bits, 61x61 mm chip size. EMC-owned specimen holders: Double Tilt (+/- 40 degrees alpha, +/- 30 degrees beta): with Be cup for XEDS liquid nitrogen cooled (96 K) with Be cup heating (1270 K) In-plane magnetic field (tilt +/- 40 degrees alpha) Liquid He cooled (tilt +/- 40 degrees alpha, rotate 360 degrees)

29

Dynamic imaging with electron microscopy  

ScienceCinema (OSTI)

Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

2014-05-30T23:59:59.000Z

30

Dynamic imaging with electron microscopy  

SciTech Connect (OSTI)

Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

2014-02-20T23:59:59.000Z

31

Microscopy. II. Electron Microscopy: A Review  

Science Journals Connector (OSTI)

...the best image under the lower resolving power of optical microscopes. For example...Experimental Infection with the Virus of Foot and Mouth Disease. J. Exper. Med...Further Improvements in the Resolving Power of the Electron Microscope. J. Appi...

Cecily Cannan Selby

1953-11-01T23:59:59.000Z

32

Electron Microscopy | Center for Functional Nanomaterials  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Microscopy Facility Electron Microscopy Facility Electron Microscopy This facility consists of four top-of-the line transmission electron microscopes, two of which are highly specialized instruments capable of extreme levels of resolution, achieved through spherical aberration correction. The facility is also equipped with extensive sample-preparation capabilities. The scientific interests of the staff focus on understanding the microscopic origin of the physical and chemical behavior of materials, with specific emphasis on in-situ studies of materials in native, functional environments. Capabilities Atomic-resolution imaging of internal materials structure with scanning transmission and transmission electron microscopy Spectroscopic characterization with energy dispersive x-ray

33

Faculty Position in Materials Electron Microscopy  

E-Print Network [OSTI]

Faculty Position in Materials Electron Microscopy at the Ecole Polytechnique Fédérale de Lausanne in electron microscopy of materials within its Institute of Materials. We seek exceptional individuals who community. Top-level applications are invited from candidates at the cutting edge of electron microscopic

Candea, George

34

Electron microscopy and microanalysis Two transmission electron microscopes  

E-Print Network [OSTI]

Electron microscopy and microanalysis Two transmission electron microscopes (TEM) and three scanning electron micro- scopes (SEM) are operated by the De- partment. Attachments for TEM include energy dispersive X-ray spectrometer (EDS), scanning transmission attachment, serial electron energy loss

35

Fast electron microscopy via compressive sensing  

DOE Patents [OSTI]

Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

2014-12-09T23:59:59.000Z

36

In-situ Transmission Electron Microscopy and Spectroscopy Studies...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Transmission Electron Microscopy and Spectroscopy Studies of Interfaces in Li-ion Batteries: Challenges and In-situ Transmission Electron Microscopy and Spectroscopy Studies of...

37

Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...  

Broader source: Energy.gov (indexed) [DOE]

Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-High Resolution Electron Microscopy for Catalyst Characterization 2011 DOE Hydrogen and Fuel Cells...

38

Ultra-high Resolution Electron Microscopy for Catalyst Characterizatio...  

Broader source: Energy.gov (indexed) [DOE]

high Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization 2009 DOE Hydrogen Program and Vehicle...

39

Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...  

Broader source: Energy.gov (indexed) [DOE]

High Resolution Electron Microscopy for Catalyst Characterization Ultra-High Resolution Electron Microscopy for Catalyst Characterization 2010 DOE Vehicle Technologies and Hydrogen...

40

Atomic Force and Scanning Electron Microscopy of Atmospheric Particles  

E-Print Network [OSTI]

conducted so as to characterize atmospheric aerosols from anthropogenic (pollution) and natural (sea saltAtomic Force and Scanning Electron Microscopy of Atmospheric Particles ZAHAVA BARKAY,1 * AMIT 69978, Israel KEY WORDS atmospheric aerosols; atomic force microscopy; scanning electron microscopy

Shapira, Yoram

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


41

New Developments in Transmission Electron Microscopy for Nanotechnology**  

E-Print Network [OSTI]

New Developments in Transmission Electron Microscopy for Nanotechnology** By Zhong Lin Wang* 1. Electron Microscopy and Nanotechnology Nanotechnology, as an international initiative for science manufacturing are the foundation of nanotechnology. Tracking the historical background of why nanotechnology

Wang, Zhong L.

42

Tomography and High-Resolution Electron Microscopy Study of Surfaces...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Tomography and High-Resolution Electron Microscopy Study of Surfaces and Porosity in a Plate-Like ?-Al2O3. Tomography and High-Resolution Electron Microscopy Study of...

43

Comparison between direct methods for determination of microbial cell volume: electron microscopy and electronic particle sizing.  

Science Journals Connector (OSTI)

...than those processed for electronic particle sizing, reflecting...Electron Microscopy and Electronic Particle Sizing E. MONTESINOS...ofMicrobiology and Institute for Fundamental Biology, Autonomous University...transmission electron microscopy and electronic particle sizing. Statistically...

E Montesinos; I Esteve; R Guerrero

1983-05-01T23:59:59.000Z

44

TRANSMISSION ELECTRON MICROSCOPY OF WEAKLY DEFORMED ALKALI HALIDE CRYSTALS  

E-Print Network [OSTI]

377 TRANSMISSION ELECTRON MICROSCOPY OF WEAKLY DEFORMED ALKALI HALIDE CRYSTALS H. STRUNK Max'importance croissante du durcissement de la solution solide. Abstract. 2014 Transmission electron microscopy (TEM Abstracts 7j66 - 7 I' 1. Introduction. - It is only some years ago that transmission electron microscopy

Boyer, Edmond

45

In-Situ Electron Microscopy of Electrical Energy Storage Materials...  

Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials 2011 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies...

46

In-Situ Electron Microscopy of Electrical Energy Storage Materials...  

Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials 2012 DOE Hydrogen and Fuel Cells Program and Vehicle Technologies...

47

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Microscopy Laboratory, MST-6 Electron Microscopy Laboratory, MST-6 MST-6 Home Home In the MSL FEI Tecnai F30 Analytical TEM/STEM JEOL 6300FXV High Resolution SEM JEOL 3000F High Resolution Transmission Electron Microscope Philips XL30 F Scanning Electron Microscope & Orientation Imaging System Phillips CM30 Transmission Electron Microscope In the Sigma Building JEOL 840 EPMA with Wavelength Dispersive Spectroscopy FEI Strata DB235 FIB/SEM FEI XL30 Environmental Scanning Electron Microscope & Orientation Imaging System CONTACTS Bob Field 665.3938 Pat Dickerson 665.3036 Rob Dickerson 667.6337 Rod McCabe 606.1649 The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory (EML) is part of MST-6, the Materials Technology - Metallurgy Group within the Materials Science and Technology Division at Los Alamos National Laboratory. It is a facility dedicated to the characterization of materials primarily through imaging, chemical, and crystallographic analyses of material microstructures with several electron and ion beam instruments. Accessory characterization techniques and equipment include energy dispersive x-ray analysis (EDS), wavelength dispersive x-ray analysis (WDS), electron backscatter diffraction (EBSD) and orientation imaging microscopy (OIM), and electron energy loss spectroscopy (EELS).

48

Ion-induced electron emission microscopy  

DOE Patents [OSTI]

An ion beam analysis system that creates multidimensional maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the secondary electrons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted secondary electrons are collected in a strong electric field perpendicular to the sample surface and (optionally) projected and refocused by the electron lenses found in a photon emission electron microscope, amplified by microchannel plates and then their exact position is sensed by a very sensitive X Y position detector. Position signals from this secondary electron detector are then correlated in time with nuclear, atomic or electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these secondary electrons in the fit place.

Doyle, Barney L. (Albuquerque, NM); Vizkelethy, Gyorgy (Albuquerque, NM); Weller, Robert A. (Brentwood, TN)

2001-01-01T23:59:59.000Z

49

Instrument Series: Microscopy Environmental Transmission Electron Microscope  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Environmental Transmission Environmental Transmission Electron Microscope EMSL's environmental transmission electron microscope (ETEM) provides in situ capabilities that enable atomic-resolution imaging and spectroscopic studies of materials under dynamic operating conditions. In contrast to traditional operation of TEM under high vacuum, EMSL's ETEM uniquely allows imaging within high- temperature and gas environments-with a gas pressure up to 20 Torr. With a spherical aberration corrector for the objective lens, the ETEM captures atomic-level processes as they occur, enabling vital research across a range of scientific fields. Research Applications Chemical science and engineering - providing in situ observation of catalytic processes with atomic-level resolution Materials science and engineering - allowing

50

Scanning Transmission Electron Microscopy Investigations of Complex Oxides  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Scanning Transmission Electron Microscopy Investigations of Complex Oxides Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of Chemistry, University of South Carolina High-Angle-Annular-Dark-Field/Scanning Transmission Electron Microscopy (HAADF/STEM) is a technique uniquely suited for detailed studies of the structure and composition of complex oxides. The HAADF detector collects electrons which have interact inelastically with the potentials of the atoms in the specimen and therefore resembles the better known Z2 (Z is atomic number) Rutherford scattering. One class of important catalysts consists of bronzes based on pentagonal {Mo6O21} building units; these include Mo5O14 and Mo17O47. In the last 20 years, new materials doped with

51

Imaging Hydrated Microbial Extracellular Polymers: Comparative Analysis by Electron Microscopy  

SciTech Connect (OSTI)

Microbe-mineral and -metal interactions represent a major intersection between the biosphere and geosphere but require high-resolution imaging and analytical tools for investigating microscale associations. Electron microscopy has been used extensively for geomicrobial investigations and although used bona fide, the traditional methods of sample preparation do not preserve the native morphology of microbiological components, especially extracellular polymers. Herein, we present a direct comparative analysis of microbial interactions using conventional electron microscopy approaches of imaging at room temperature and a suite of cryo-electron microscopy methods providing imaging in the close-to-natural hydrated state. In situ, we observed an irreversible transformation of bacterial extracellular polymers during the traditional dehydration-based sample preparation that resulted in the collapse of hydrated gel-like EPS into filamentous structures. Dehydration-induced polymer collapse can lead to inaccurate spatial relationships and hence could subsequently affect conclusions regarding nature of interactions between microbial extracellular polymers and their environment.

Dohnalkova, Alice; Marshall, Matthew J.; Arey, Bruce W.; Williams, Kenneth H.; Buck, Edgar C.; Fredrickson, Jim K.

2011-02-01T23:59:59.000Z

52

CFN Operations and Safety Awareness (COSA) Checklist Electron Microscopy Facility  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Microscopy Facility Electron Microscopy Facility Building 735 This COSA form must be completed for all experimenters working in the CFN and must be submitted to the CFN User Office for badge access. CFN Safety Awareness Policy: Each user must be instructed in the safe procedures in CFN related activities. CFN Facility Laboratory personnel shall keep readily available all relevant instructions and safety literature. Employee/Guest Name Life/Guest Number Department/Division ES&H Coordinator/Ext. Facility Manager COSA Trainer Guest User Staff USER ADMINISTRATION Checked in at User Administration and has valid BNL ID badge Safety Approval Form (SAF) approved. Training requirements completed (Indicate additional training specified in SAF or ESR in lines provided below):

53

Recent advances in electron imaging, image interpretation and applications: environmental scanning electron microscopy  

Science Journals Connector (OSTI)

...A treatment of the physics governing this phenomenon...electron microscopy, the physics of which provides much...Varaprasad, L. H. 1991 Handbook of optical constants...ed.) 1991 CRC handbook of chemistry and physics. Boca Raton, FL...

2003-01-01T23:59:59.000Z

54

A New Cubic B-C-N Compound Revealed by High-Resolution Analytical Electron Microscopy  

Science Journals Connector (OSTI)

......nitride by electron energy-loss spectroscopy...Egerton RF: Electron energy loss spectroscopy...electron microscope. New York and London: Plenum...electron microscopy. New York: Plenum Press...system by electron energy loss spectroscopy......

Yoshio Bando; Satoshi Nakano; Keiji Kurashima

1996-04-01T23:59:59.000Z

55

Coal Combustion Fly Ash Characterization: Electron Spectroscopy for Chemical Analysis, Energy Dispersive X-ray Analysis, and Scanning Electron Microscopy  

Science Journals Connector (OSTI)

The surface and bulk properties of five samples of fly ash have been examined by electron spectroscopy for chemical analysis (ESCA), scanning electron microscopy (SEM) and energy...

Rothenberg, S J; Denee, P; Holloway, P

1980-01-01T23:59:59.000Z

56

Electron Microscopy of Myosin Molecules from Muscle and Non-Muscle Sources  

Science Journals Connector (OSTI)

...1976 research-article Electron Microscopy of Myosin...Muscle and Non-Muscle Sources A. Elliott G. Offer...give the two heads). Electron microscopy of myosin...muscle and non-muscle sources. | Journal Article...Chickens Microscopy, Electron Muscle Proteins Myosins...

1976-01-01T23:59:59.000Z

57

Aberration-Coreected Electron Microscopy at Brookhaven National Laboratory  

SciTech Connect (OSTI)

The last decade witnessed the rapid development and implementation of aberration correction in electron optics, realizing a more-than-70-year-old dream of aberration-free electron microscopy with a spatial resolution below one angstrom [1-9]. With sophisticated aberration correctors, modern electron microscopes now can reveal local structural information unavailable with neutrons and x-rays, such as the local arrangement of atoms, order/disorder, electronic inhomogeneity, bonding states, spin configuration, quantum confinement, and symmetry breaking [10-17]. Aberration correction through multipole-based correctors, as well as the associated improved stability in accelerating voltage, lens supplies, and goniometers in electron microscopes now enables medium-voltage (200-300kV) microscopes to achieve image resolution at or below 0.1nm. Aberration correction not only improves the instrument's spatial resolution but, equally importantly, allows larger objective lens pole-piece gaps to be employed thus realizing the potential of the instrument as a nanoscale property-measurement tool. That is, while retaining high spatial resolution, we can use various sample stages to observe the materials response under various temperature, electric- and magnetic- fields, and atmospheric environments. Such capabilities afford tremendous opportunities to tackle challenging science and technology issues in physics, chemistry, materials science, and biology. The research goal of the electron microscopy group at the Dept. of Condensed Matter Physics and Materials Science and the Center for Functional Nanomaterials, as well as the Institute for Advanced Electron Microscopy, Brookhaven National Laboratory (BNL), is to elucidate the microscopic origin of the physical- and chemical-behavior of materials, and the role of individual, or groups of atoms, especially in their native functional environments. We plan to accomplish this by developing and implementing various quantitative electron microscopy techniques in strongly correlated electron systems and nanostructured materials. As a first step, with the support of Materials Science Division, Office of Basic Energy Science, US Department of Energy, and the New York State Office of Science, Technology, and Academic Research, recently we acquired three aberration-corrected electron microscopes from the three major microscope manufacturers, i.e., JEOL, Hitachi, and FEI. The Hitachi HD2700C is equipped with a probe corrector, the FEI Titan 80-300 has an imaging corrector, while the JEOL2200MCO has both. All the correctors are of the dual-hexapole type, designed and manufactured by CEOS GmbH based on the design due to Rose and Haider [3, 18]. All these three are one-of-a-kind in the US, designed for specialized capabilities in characterizing nanoscale structure. In this chapter, we review the performance of these state-of-the art instruments and the new challenges associated with the improved spatial resolution, including the environment requirements of the laboratory that hosts these instruments. Although each instrument we describe here has its own strengths and drawbacks, it is not our intention to rank them in terms of their performance, especially their spatial resolution in imaging.

Zhu,Y.; Wall, J.

2008-04-01T23:59:59.000Z

58

Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series  

SciTech Connect (OSTI)

In this study, a combined tilt- and focal series is proposed as a new recording scheme for high-angle annular dark-field scanning transmission electron microscopy (STEM) tomography. Three-dimensional (3D) data were acquired by mechanically tilting the specimen, and recording a through-focal series at each tilt direction. The sample was a whole-mount macrophage cell with embedded gold nanoparticles. The tilt focal algebraic reconstruction technique (TF-ART) is introduced as a new algorithm to reconstruct tomograms from such combined tilt- and focal series. The feasibility of TF-ART was demonstrated by 3D reconstruction of the experimental 3D data. The results were compared with a conventional STEM tilt series of a similar sample. The combined tilt- and focal series led to smaller missing wedge artifacts, and a higher axial resolution than obtained for the STEM tilt series, thus improving on one of the main issues of tilt series-based electron tomography.

Dahmen, Tim [German Research Center for Artificial Intelligence (DFKI), Germany] [German Research Center for Artificial Intelligence (DFKI), Germany; Baudoin, Jean-Pierre G [ORNL] [ORNL; Lupini, Andrew R [ORNL] [ORNL; Kubel, Christian [Karlsruhe Institute of Technology, Leopoldshafen, Germany] [Karlsruhe Institute of Technology, Leopoldshafen, Germany; Slusallek, Phillip [German Research Center for Artificial Intelligence (DFKI), Germany] [German Research Center for Artificial Intelligence (DFKI), Germany; De Jonge, Niels [ORNL] [ORNL

2014-01-01T23:59:59.000Z

59

In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry  

SciTech Connect (OSTI)

Oxides and their tailored structures are at the heart of electrochemical energy storage technologies and advances in understanding and controlling the dynamic behaviors in the complex oxides, particularly at the interfaces, during electrochemical processes will catalyze creative design concepts for new materials with enhanced and better-understood properties. Such knowledge is not accessible without new analytical tools. New innovative experimental techniques are needed for understanding the chemistry and structure of the bulk and interfaces, more importantly how they change with electrochemical processes in situ. Analytical Transmission Electron Microscopy (TEM) is used extensively to study electrode materials ex situ and is one of the most powerful tools to obtain structural, morphological, and compositional information at nanometer scale by combining imaging, diffraction and spectroscopy, e.g., EDS (energy dispersive X-ray spectrometry) and Electron Energy Loss Spectrometry (EELS). Determining the composition/structure evolution upon electrochemical cycling at the bulk and interfaces can be addressed by new electron microscopy technique with which one can observe, at the nanometer scale and in situ, the dynamic phenomena in the electrode materials. In electrochemical systems, for instance in a lithium ion battery (LIB), materials operate under conditions that are far from equilibrium, so that the materials studied ex situ may not capture the processes that occur in situ in a working battery. In situ electrochemical operation in the ultra-high vacuum column of a TEM has been pursued by two major strategies. In one strategy, a 'nano-battery' can be fabricated from an all-solid-state thin film battery using a focused ion beam (FIB). The electrolyte is either polymer based or ceramic based without any liquid component. As shown in Fig. 1a, the interfaces between the active electrode material/electrolyte can be clearly observed with TEM imaging, in contrast to the composite electrodes/electrolyte interfaces in conventional lithium ion batteries, depicted in Fig.1b, where quantitative interface characterization is extremely difficult if not impossible. A second strategy involves organic electrolyte, though this approach more closely resembles the actual operation conditions of a LIB, the extreme volatility In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry by Ying Shirley Meng, Thomas McGilvray, Ming-Che Yang, Danijel Gostovic, Feng Wang, Dongli Zeng, Yimei Zhu, and Jason Graetz of the organic electrolytes present significant challenges for designing an in situ cell that is suitable for the vacuum environment of the TEM. Significant progress has been made in the past few years on the development of in situ electron microscopy for probing nanoscale electrochemistry. In 2008, Brazier et al. reported the first cross-section observation of an all solid-state lithium ion nano-battery by TEM. In this study the FIB was used to make a 'nano-battery,' from an all solid-state battery prepared by pulsed laser deposition (PLD). In situ TEM observations were not possible at that time due to several key challenges such as the lack of a suitable biasing sample holder and vacuum transfer of sample. In 2010, Yamamoto et al. successfully observed changes of electric potential in an all-solid-state lithium ion battery in situ with electron holography (EH). The 2D potential distribution resulting from movement of lithium ions near the positive-electrode/electrolyte interface was quantified. More recently Huang et al. and Wang et al. reported the in situ observations of the electrochemical lithiation of a single SnO{sub 2} nanowire electrode in two different in situ setups. In their approach, a vacuum compatible ionic liquid is used as the electrolyte, eliminating the need for complicated membrane sealing to prevent the evaporation of carbonate based organic electrolyte into the TEM column. One main limitation of this approach is that EELS spectral imaging is not possible due to the high plasmon signal of the ionic li

Graetz J.; Meng, Y.S.; McGilvray, T.; Yang, M.-C.; Gostovic, D.; Wang, F.; Zeng, D.; Zhu, Y.

2011-10-31T23:59:59.000Z

60

Electron and Scanning Probe Microscopies | U.S. DOE Office of Science (SC)  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron and Scanning Probe Microscopies Electron and Scanning Probe Microscopies Materials Sciences and Engineering (MSE) Division MSE Home About Research Areas Energy Frontier Research Centers (EFRCs) DOE Energy Innovation Hubs BES Funding Opportunities The Computational Materials and Chemical Sciences Network (CMCSN) Theoretical Condensed Matter Physics Scientific Highlights Reports and Activities Principal Investigators' Meetings BES Home Research Areas Electron and Scanning Probe Microscopies Print Text Size: A A A RSS Feeds FeedbackShare Page This research area supports basic research in condensed matter physics and materials physics using electron scattering and microscopy and scanning probe techniques. The research includes experiments and theory to understand the atomic, electronic, and magnetic structures of materials.

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
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61

E-Print Network 3.0 - analytical electron microscopy Sample Search...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Director Rutgers Research Showcase Summary: Electron Microscopy Nuclear Magnetic Resonance Spectroscopy X-Ray Diffraction Facility (XRD) Micro-Analytical... for...

62

Versatile Silicon Photodiode Detector Technology for Scanning Electron Microscopy with High-Efficiency Sub-5 keV Electron Detection  

E-Print Network [OSTI]

Versatile Silicon Photodiode Detector Technology for Scanning Electron Microscopy with High for Scanning Electron Microscopy, based on ultrashallow p+ n boron-layer photodiodes, features nm-thin anodes, closely-packed photodiodes and through-wafer apertures allow flexible configurations for optimal material

Technische Universiteit Delft

63

A Transmission Electron Microscopy Study of Presolar Hibonite  

Science Journals Connector (OSTI)

We report isotopic and microstructural data on five presolar hibonite grains (KH1, KH2, KH6, KH15, and KH21) identified in an acid residue of the Krymka LL3.1 ordinary chondrite. Isotopic measurements by secondary ion mass spectrometry (SIMS) verified a presolar circumstellar origin for the grains. Transmission electron microscopy (TEM) examination of the crystal structure and chemistry of the grains was enabled by in situ sectioning and lift-out with a focused-ion-beam scanning-electron microscope (FIB-SEM). Comparisons of isotopic compositions with models indicate that four of the five grains formed in low-mass stars that evolved through the red giant/asymptotic giant branches (RGBs/AGBs), whereas one grain formed in the ejecta of a Type II supernova. Selected-area electron-diffraction patterns show that all grains are single crystals of hibonite. Some grains contain minor structural perturbations (stacking faults) and small spreads in orientation that can be attributed to a combination of growth defects and mechanical processing by grain-grain collisions. The similar structure of the supernova grain to those from RGB/AGB stars indicates a similarity in the formation conditions. Radiation damage (e.g., point defects), if present, occurs below our detection limit. Of the five grains we studied, only one has the pure hibonite composition of CaAl12O19. All others contain minor amounts of Mg, Si, Ti, and Fe. The microstructural data are generally consistent with theoretical predictions, which constrain the circumstellar condensation temperature to a range of 1480-1743K, assuming a corresponding total gas pressure between 1 ? 106 and 1 ? 103atm. The TEM data were also used to develop a calibration for SIMS determination of Ti contents in oxide grains. Grains with extreme 18O depletions, indicating deep mixing has occurred in their parent AGB stars, are slightly Ti enriched compared with grains from stars without deep mixing, most likely reflecting differences in grain condensation conditions.

Thomas J. Zega; Conel M. O'D. Alexander; Larry R. Nittler; Rhonda M. Stroud

2011-01-01T23:59:59.000Z

64

An electron microscopy study of wear in polysilicon microelectromechanical systems in ambient air  

E-Print Network [OSTI]

. © 2006 Elsevier B.V. All rights reserved. Keywords: Silicon; MEMS; Wear; Electron microscopy 1An electron microscopy study of wear in polysilicon microelectromechanical systems in ambient air D.H. Alsem a,b,c,, E.A. Stach d , M.T. Dugger e , M. Enachescu b , R.O. Ritchie a,b a Department of Materials

Ritchie, Robert

65

Fabrication of curved-line nanostructures on membranes for transmission electron microscopy investigations of domain walls  

E-Print Network [OSTI]

Fabrication of curved-line nanostructures on membranes for transmission electron microscopy, Cambridge CB2 3QZ, United Kingdom Available online 28 February 2006 Abstract We have fabricated curved-line ferromagnetic nanostructures on membranes for transmission electron microscopy investigations of the equilibrium

Dunin-Borkowski, Rafal E.

66

STUDIES OF DENGUE FEVER VIRUS BY ELECTRON MICROSCOPY  

Science Journals Connector (OSTI)

...MICROSCOPY Reginald L. Reagan A. L. Brueckner Live Stock Sanitary Service Laboratory...MICROSCOPY REGINALD L. REAGAN AND A. L. BRUECKNER Live Stock Sanitary Service Laboratory...material 233 REGINALD L. REAGAN AND A. L. BRUECKNER Figure 1. Dengue fever virus (mouse...

Reginald L. Reagan; A. L. Brueckner

1952-08-01T23:59:59.000Z

67

Slow positron annihilation spectroscopy and electron microscopy of electron beam evaporated cobalt and nickel silicides  

SciTech Connect (OSTI)

Metal silicide thin films on single-crystal silicon substrates are the subject of much research, due to their applications as electrical contacts and interconnects, diffusion barriers, low resistance gates, and field-assisted positron moderators, among others. Defects within the silicide layer and/or at the silicide/silicon interface are detrimental to device performance, since they can act as traps for charge carriers, as well as positrons. Pinholes penetrating the film are another detriment particularly for cobalt silicide films, since they allow electrons to permeate the film, rather than travel ballistically, in addition to greatly increasing surface area for recombination events. A series of epitaxial cobalt and nickel silicide thin films, deposited via electron-beam evaporation and annealed at various temperatures, have been grown on single-crystal silicon (111) substrates, in an effort to establish a relationship between deposition and processing parameters and film quality. The films have been analyzed by transmission and scanning electron microscopy, sputter depth profile Auger, and slow positron annihilation spectroscopy. The latter has been shown to both correlate and complement the traditional electron microscopy results.

Frost, R.L.; DeWald, A.B. (Georgia Institute of Technology, Atlanta, Georgia 30332 (USA)); Zaluzec, M.; Rigsbee, J.M. (University of Illinois, Urbana, Illinois 61801 (USA)); Nielsen, B.; Lynn, K.G. (Brookhaven National Laboratory, Upton, New York 11973 (USA))

1990-07-01T23:59:59.000Z

68

Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy  

SciTech Connect (OSTI)

Gold nanoparticle films are of interest in several branches of science and technology, and accurate sample characterization is needed but technically demanding. We prepared such films by DC magnetron sputtering and recorded their mass thickness by Rutherford backscattering spectroscopy. The geometric thickness d{sub g}from the substrate to the tops of the nanoparticleswas obtained by scanning electron microscopy (SEM) combined with image analysis as well as by atomic force microscopy (AFM). The various techniques yielded an internally consistent characterization of the films. In particular, very similar results for d{sub g} were obtained by SEM with image analysis and by AFM.

Lansker, Pia C., E-mail: pia.lansaker@angstrom.uu.se; Niklasson, Gunnar A.; Granqvist, Claes G. [Department of Engineering Sciences, The ngstrm Laboratory, Uppsala University, P. O. Box 534, SE-751 21 Uppsala (Sweden); Halln, Anders [Royal Institute of Technology, KTH-ICT, Elektrum 229, Kista, SE-164 40 Stockholm (Sweden)

2014-10-15T23:59:59.000Z

69

A CCD Camera with Electron Decelerator for Intermediate Voltage Electron Microscopy  

SciTech Connect (OSTI)

Electron microscopists are increasingly turning to Intermediate Voltage Electron Microscopes (IVEMs) operating at 300 - 400 kV for a wide range of studies. They are also increasingly taking advantage of slow-scan charge coupled device (CCD) cameras, which have become widely used on electron microscopes. Under some conditions CCDs provide an improvement in data quality over photographic film, as well as the many advantages of direct digital readout. However, CCD performance is seriously degraded on IVEMs compared to the more conventional 100 kV microscopes. In order to increase the efficiency and quality of data recording on IVEMs, we have developed a CCD camera system in which the electrons are decelerated to below 100 kV before impacting the camera, resulting in greatly improved performance in both signal quality and resolution compared to other CCDs used in electron microscopy. These improvements will allow high-quality image and diffraction data to be collected directly with the CCD, enabling improvements in data collection for applications including high-resolution electron crystallography, single-particle reconstruction of protein structures, tomographic studies of cell ultrastructure and remote microscope operation. This approach will enable us to use even larger format CCD chips that are being developed with smaller pixels.

Downing, Kenneth H; Downing, Kenneth H.; Mooney, Paul E.

2008-03-17T23:59:59.000Z

70

Analytical electron microscopy characterization of uranium-contaminated soils from the Fernald Site, FY1993 report  

SciTech Connect (OSTI)

A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM) is being used to determine the nature of uranium in soils from the Fernald Environmental Management Project. The information gained from these studies is being used to develop and test remediation technologies. Investigations using SEM have shown that uranium is contained within particles that are typically 1 to 100 {mu}m in diameter. Further analysis with AEM has shown that these uranium-rich regions are made up of discrete uranium-bearing phases. The distribution of these uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Cunnane, J.C.; Brown, N.R.; Dietz, N.L.

1994-10-01T23:59:59.000Z

71

Los Alamos: MST: MST-6: EML: Electron Microscopy Laboratory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) FEI Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) This is a versatile field emission scanning electron microscope integrated with a focused ion beam column that is used for sophisticated SEM and TEM sample preparation, micromachining, and ultrahigh resolution SEM imaging. The microscope is also equipped for x-ray microanalysis and crystallographic orientation imaging. Microscope consists of a Hexalens SFEG electron beam column, and a Magnum ion beam column with a gallium liquid metal ion source. Imaging with both secondary electrons and ions. Digital image acquisition. Small, stable, high brightness Schottky based field emission electron source provides 1.5 nm resolution at 30 kV. Three electron beam lens modes - normal imaging, high resolution imaging, and EDS imaging.

72

ABSTRACTS IN REPORTS CONCERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......Thoracic Lymphatics of Living Rabbits and Sites of Escape of Car- bon Particles from the Vessels: Fumihiko KATO (First Dept...deafness. Using light and elect- ron microscopy he studied the defective organ of Corti in Shaker-1 mouse, one strain of congeni......

ABSTRACTS

1967-01-01T23:59:59.000Z

73

Morphological properties of pillared layered materials investigated by electron microscopy technique  

E-Print Network [OSTI]

Scanning electron microscopy was used to investigate morphological features of a diverse range of pillared layered materials. Pillared layered zirconium phosphates, zirconium polyimine phosphonates and anion exchanger derivatives, zinc...

Navas de Mascianglioli, Margarit

2012-06-07T23:59:59.000Z

74

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

3000F High Resolution Transmission Electron Microscope 3000F High Resolution Transmission Electron Microscope JEOL 3000F High Resolution Transmission Electron Microscope This is a high-resolution TEM equipped with an electron energy-loss spectrometer and a CCD camera for digital image acquisition. This microscope is used primarily for imaging the atomic structure of defects and interfaces in materials. Field emission electron source. Coherent source with an energy spread of 0.8 eV. Operation at accelerating voltages of up to 300 kV. +/- 10° of eucentric specimen tilt. Point to point resolution of 0.17 nm; 0.10 nm resolution can be extracted by computer processing. Gatan Multiscan CCD Camera for digital image acquisition. Automated microscope alignment: defocus calibration/adjustment, astigmatism correction and beam-tilt correction (automatic coma-free alignment).

75

Observation of buried interfaces with low energy electron microscopy  

Science Journals Connector (OSTI)

In this Letter we show that a coherent low energy electron beam (<100 eV) can be used to obtain real space images of structures and defects buried deep below the surface of the sample. The elastic strain fields of such buried structures, extending to the free surface, are found to give rise to localized phase shifts in the reflected electron waves, resulting in excellent image contrast under slight objective lens defocus conditions. We can now image the formation and evolution of buried interfaces and defects in situ, and in real time. Because of the very low electron energies used, this imaging method is nondestructive.

R. M. Tromp, A. W. Denier van der Gon, F. K. LeGoues, and M. C. Reuter

1993-11-15T23:59:59.000Z

76

In-situ UHV Electron Microscopy of Surfaces  

Science Journals Connector (OSTI)

Recently great progress has been made in surface science due to the development of ultra-high-vacuum (UHV) techniques and related surface-analytical methods like ... (LEED), Auger electron spectroscopy (AES), UHV

Katsumichi Yagi; Kunio Takayanagi; Goro Honjo

1982-01-01T23:59:59.000Z

77

THE THIRTY-EIGHTH ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......electron- opaque material. Intramembranous...the presynaptic active zone. Third type...microscopy. Membranous materials extended from the...gun with a point cathode Kohki NIMURA, Masahiko...464 Japan A point cathode triode electron...made of magnetic materials (pure iron......

The Thirty-eighth Annual Meeting of the Japanese Society of Electron Microscopy: held at Komaba Eminence; Tokyo; May 26?28; 1982

1982-01-01T23:59:59.000Z

78

In-Situ Electrochemical Transmission Electron Microscopy for Battery Research  

SciTech Connect (OSTI)

The recent development of in-situ liquid stages for (scanning) transmission electron microscopes now makes it possible for us to study the details of electrochemical processes under operando conditions. As electrochemical processes are complex, care must be taken to calibrate the system before any in-situ/operando observations. In addition, as the electron beam can cause effects that look similar to electrochemical processes at the electrolyte/electrode interface, an understanding of the role of the electron beam in modifying the operando observations must also be understood. In this paper we describe the design, assembly, and operation of an in-situ electrochemical cell, paying particular attention to the method for controlling and quantifying the experimental parameters. The use of this system is then demonstrated for the lithiation/delithiation of silicon nanowires.

Mehdi, Beata L [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Gu, Meng [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Parent, Lucas [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Xu, WU [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Nasybulin, Eduard [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Chen, Xilin [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Unocic, Raymond R [ORNL] [ORNL; Xu, Pinghong [University of California, Davis] [University of California, Davis; Welch, David [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Abellan, Patricia [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Zhang, Ji-Guang [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Liu, Jun [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Wang, Chongmin [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Arslan, Ilke [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Evans, James E [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Browning, Nigel [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL)

2014-01-01T23:59:59.000Z

79

ABSTRACTS IN REPORTS CONCERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......branches expand upwards according to physiolo- gical and ecological conditions. B-65-17O. Cyclic changes of the Golgi body...further it was assumed" that the network of smooth ER might be vehicles'of precursor of steroid hormone.- B-66-115. An Electron......

ABSTRACTS

1967-01-01T23:59:59.000Z

80

Visualizing Macromolecular Complexes with In Situ Liquid Scanning Transmission Electron Microscopy  

SciTech Connect (OSTI)

A central focus of biological research is understanding the structure/function relationship of macromolecular protein complexes. Yet conventional transmission electron microscopy techniques are limited to static observations. Here we present the first direct images of purified macromolecular protein complexes using in situ liquid scanning transmission electron microscopy. Our results establish the capability of this technique for visualizing the interface between biology and nanotechnology with high fidelity while also probing the interactions of biomolecules within solution. This method represents an important advancement towards allowing future high-resolution observations of biological processes and conformational dynamics in real-time.

Evans, James E.; Jungjohann, K. L.; Wong, Peony C. K.; Chiu, Po-Lin; Dutrow, Gavin H.; Arslan, Ilke; Browning, Nigel D.

2012-11-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


81

In Situ, Real-Time Characterization of Silicide Nanostructure Coarsening Dynamics by Photo-Electron Emission Microscopy.  

E-Print Network [OSTI]

??Photo-electron emission microscopy (PEEM) was used to observe the growth and coarsening dynamics of transition metal (TM) silicide and rare earth (RE) silicide nanostructures on (more)

Zeman, Matthew Casimir

2007-01-01T23:59:59.000Z

82

Momentum-resolved Electron Energy-Loss Spectroscopy Master Thesis, Electron Microscopy Group of Materials Science, Prof. Ute Kaiser  

E-Print Network [OSTI]

of Materials Science, Prof. Ute Kaiser Background Electron energy-loss spectroscopy (EELS) is a well like plasmons at a few 10eV, to core-shell excitations at high energy losses. In addition to the energy Microscopy group of Material Sciences in Ulm has gained experience in the acquisition and analysis of energy

Pfeifer, Holger

83

A method for the alignment of heterogeneous macromolecules from electron microscopy  

E-Print Network [OSTI]

dataset. ? 2009 Published by Elsevier Inc. 1. Introduction Single-particle electron microscopy (EM and Microbial Biology, University of California, Berkeley, CA 94720-3102, USA b Physical Biosciences Division, Lawrence Berkeley National Laboratory, CA 94720, USA a r t i c l e i n f o Article history: Received 13

84

Rumen microbial degradation of modified lignin plants observed by electron microscopy  

E-Print Network [OSTI]

Rumen microbial degradation of modified lignin plants observed by electron microscopy C Mign6, E-Genès-Champanelle, France The microbial degradation of modified lignin tobacco (Samson variety) plants (homozygous line 40 to the corresponding cinnamyl alcohols which are the direct monomeric precursors of the lignin. Only the stems were

Paris-Sud XI, Université de

85

Dynamic Characterization of Graphene Growth and Etching by Oxygen on Ru(0001) by Photoemission Electron Microscopy  

E-Print Network [OSTI]

Dynamic Characterization of Graphene Growth and Etching by Oxygen on Ru(0001) by Photoemission of graphene on Ru(0001) was investigated by photoemission electron microscopy (PEEM) and scanning tunneling, we show that graphene overlayers with sizes ranging from nanometers to sub-millimeters have been

Bao, Xinhe

86

FtsZ Condensates: An In Vitro Electron Microscopy Study David Popp,1  

E-Print Network [OSTI]

FtsZ Condensates: An In Vitro Electron Microscopy Study David Popp,1 Mitsusada Iwasa,1 Akihiro in vitro system of supramolecular condensates experimentally and theoretically is DNA, which also exists in highly condensed, tightly packed states in viruses and sperm cells in vivo.2 The principle morphologies

Erickson, Harold P.

87

Nano-mineralogy studies by advanced electron microscopy Chi Ma and George R. Rossman  

E-Print Network [OSTI]

Nano-mineralogy studies by advanced electron microscopy Chi Ma and George R. Rossman Division and planetary materials easier and faster down to nano-scales. Small but new minerals with important geological significance are being discovered. Nano-features are being discovered in many common minerals and gems, which

Ma, Chi

88

From electron energy-loss spectroscopy to multi-dimensional and multi-signal electron microscopy  

Science Journals Connector (OSTI)

......4 Colliex C . Electron Energy Loss Spectroscopy in the...eds. (1984) Vol. 9. New York: Academic Press. 65-177. 5 Egerton R . Electron Energy Loss Spectroscopy in the Electron Microscope (1986) New York: Plenum Press. 6 Isaacson......

Christian Colliex

2011-08-01T23:59:59.000Z

89

Imaging and microanalysis of thin ionomer layers by scanning transmission electron microscopy  

SciTech Connect (OSTI)

Improved conditions for imaging and spectroscopic mapping of thin perfluorosulfonic acid (PFSA) ionomer layers in fuel cell electrodes by scanning transmission electron microscopy (STEM) have been investigated. These conditions are first identified on model systems of Nafion ionomer-coated nanostructured thin films and nanoporous Si. The optimized conditions are then applied in a quantitative study of the ionomer through-layer loading for two typical electrode catalyst coatings using electron energy loss and energy dispersive X-ray spectroscopy in the transmission electron microscope. The e-beam induced damage to the perfluorosulfonic acid (PFSA) ionomer is quantified by following the fluorine mass loss with electron exposure and is then mitigated by a few orders of magnitude using cryogenic specimen cooling and a higher incident electron voltage. Multivariate statistical analysis is also applied to the analysis of spectrum images for data denoising and unbiased separation of independent components related to the catalyst, ionomer, and support.

Cullen, David A [ORNL; Koestner, Roland [General Motors Corporation; Kukreja, Ratan [General Motors Corporation; Minko, Sergiy [Clarkson University, Potsdam, NY; Trotsenko, Oleksandr [Clarkson University, Potsdam, NY; Tokarev, Alexander V [ORNL; Guetaz, Laure [French Atomic Energy Commission (CEA), Grenoble; Meyer III, Harry M [ORNL; Parish, Chad M [ORNL; More, Karren Leslie [ORNL

2014-01-01T23:59:59.000Z

90

In situ transmission electron microscopy observation of silver oxidation in ionized/atomic gas.  

SciTech Connect (OSTI)

The interaction between silver and ionized and atomic gas was observed directly by in situ transmission electron microscopy with an environmental cell for the first time. The electron beam provides dual functions as the source of both gas ionization and imaging. The concentration of ionized gas was tuned via adjusting the current density of the electron beam. Oxidation of the silver is observed in situ, indicating the presence of ionized and/or atomic oxygen. The evolution of microstructure and phase constituents was characterized. Then the oxidation rate was measured, and the relationships among grain size, mass transport rate, and electron flux were characterized. The role of the electron beam is discussed, and the results are rationalized with respect to ex situ results from the literature.

Sun, L.; Noh, K. W.; Wen, J-G.; Dillon, S. J. (Materials Science Division); (Massachusetts Inst. Tech.); (Univ. Illinois - Urbana)

2011-10-17T23:59:59.000Z

91

A new approach to nuclear microscopy: The ion-electron emission microscope  

SciTech Connect (OSTI)

A new multidimensional high lateral resolution ion beam analysis technique, Ion-Electron Emission Microscopy or IEEM is described. Using MeV energy ions, IEEM is shown to be capable of Ion Beam Induced Charge Collection (IBICC) measurements in semiconductors. IEEM should also be capable of microscopically and multidimensionally mapping the surface and bulk composition of solids. As such, IIEM has nearly identical capabilities as traditional nuclear microprobe analysis, with the advantage that the ion beam does not have to be focused. The technique is based on determining the position where an individual ion enters the surface of the sample by projection secondary electron emission microscopy. The x-y origination point of a secondary electron, and hence the impact coordinates of the corresponding incident ion, is recorded with a position sensitive detector connected to a standard photoemission electron microscope (PEEM). These signals are then used to establish coincidence with IBICC, atomic, or nuclear reaction induced ion beam analysis signals simultaneously caused by the incident ion.

Doyle, B.L.; Vizkelethy, G.; Walsh, D.S. [Sandia National Labs., Albuquerque, NM (United States); Senftinger, B. [Staib Instrumente GmbH, Langenbach (Germany); Mellon, M. [Quantar Technologies Inc., Santa Cruz, CA (United States)

1998-11-01T23:59:59.000Z

92

Recent advances in electron imaging, image interpretation and applications: environmental scanning electron microscopy  

Science Journals Connector (OSTI)

...specimens in a more `natural' state. As early...the presence of a gas in the specimen chamber...Ionizing collisions with gas molecules generate...SEs, causing a `cascade' of electrons...turn influencing gas cascade amplification. Add...

2003-01-01T23:59:59.000Z

93

Electronic structure of wurtzite II-VI compound semiconductor cleavage surfaces studied by scanning tunneling microscopy  

Science Journals Connector (OSTI)

We report atomically resolved scanning tunneling microscopy (STM) images of cleavage surfaces of wurtzite II-VI compound semiconductors. CdSe(1120), CdSe(1010), and CdS(1010) were investigated. The STM images confirm a 11 reconstruction for all surfaces. At negative and positive sample voltages the occupied and empty dangling-bond states above anions and cations, respectively, dominate the contrast of the STM images. No states in the band gap were found. The electronic structure of the surface permits the observation of dopant atoms in subsurface layers and thus also cross-sectional scanning tunneling microscopy studies of point defects and heterostructures.

B. Siemens, C. Domke, Ph. Ebert, and K. Urban

1997-11-15T23:59:59.000Z

94

TITLE: Environmental Electron Microscopy Study of the Nucleation and Growth of Si and Ge AUTHORS: Stephan Hofmann  

E-Print Network [OSTI]

transmission electron microscopy study of Si nanowire nucleation from Pd [1] and Ni under disilane exposure advances by lateral propagation of ledges, driven by catalytic dissociation of disilane and coupled Pd

Dunin-Borkowski, Rafal E.

95

Structure of the dimeric RCLH1PufX complex from Rhodobaca bogoriensis investigated by electron microscopy  

Science Journals Connector (OSTI)

...j.boekema@rug.nl ). 1 Electron Microscopy Group, Groningen Biomolecular Sciences and Biotechnology Institute, University of Groningen, , Nijenborgh 7, 9747 AG, Groningen, The Netherlands 2 IBDML - Developmental Biology Institute...

2012-01-01T23:59:59.000Z

96

Periodicity faults in chain silicates: A new type of planar lattice fault observed with high resolution electron microscopy  

Science Journals Connector (OSTI)

The existence of errors in the periodicity of the tetrahedral chains in pyroxenes and pyroxenoids is predicted. With high resolution electron microscopy of rhodonite, (Mn, Ca)5[Si5O15], and pyroxmangite, (Mn,Fe,C...

M. Czank; F. Liebau

1980-07-01T23:59:59.000Z

97

Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction  

Science Journals Connector (OSTI)

Patches of white etching layers on rail surfaces were investigated using sophisticated techniques like cross-sectional transmission electron microscopy (XTEM) and synchroton X-ray diffraction. Optical microscopy failed to resolve the microstructure, but in the TEM submicron grains with high dislocation densities and occasional twins, which are characteristic features of high carbon martensite, were observed. The martensitic structure was confirmed by evaluation of synchroton X-ray diffraction line profiles. The latter technique also allowed to determine dislocation densities of the order of 1012 cm?2 and residual compressive stresses of about 200 MPa.

W. sterle; H. Rooch; A. Pyzalla; L. Wang

2001-01-01T23:59:59.000Z

98

Biological Applications and Transmission Electron Microscopy Investigations of Mesoporous Silica Nanoparticles  

SciTech Connect (OSTI)

The research presented and discussed within involves the development of novel biological applications of mesoporous silica nanoparticles (MSN) and an investigation of mesoporous material by transmission electron microscopy (TEM). Mesoporous silica nanoparticles organically functionalized shown to undergo endocytosis in cancer cells and drug release from the pores was controlled intracellularly and intercellularly. Transmission electron microscopy investigations demonstrated the variety of morphologies produced in this field of mesoporous silica nanomaterial synthesis. A series of room-temperature ionic liquid (RTIL) containing mesoporous silica nanoparticle (MSN) materials with various particle morphologies, including spheres, ellipsoids, rods, and tubes, were synthesized. By changing the RTIL template, the pore morphology was tuned from the MCM-41 type of hexagonal mesopores to rotational moire type of helical channels, and to wormhole-like porous structures. These materials were used as controlled release delivery nanodevices to deliver antibacterial ionic liquids against Escherichia coli K12. The involvement of a specific organosiloxane function group, covalently attached to the exterior of fluorescein doped mesoporous silica nanoparticles (FITC-MSN), on the degree and kinetics of endocytosis in cancer and plant cells was investigated. The kinetics of endocystosis of TEG coated FITC-MSN is significantly quicker than FITC-MSN as determined by flow cytometry experiments. The fluorescence confocal microscopy investigation showed the endocytosis of TEG coated-FITC MSN triethylene glycol grafted fluorescein doped MSN (TEG coated-FITC MSN) into both KeLa cells and Tobacco root protoplasts. Once the synthesis of a controlled-release delivery system based on MCM-41-type mesoporous silica nanorods capped by disulfide bonds with superparamagnetic iron oxide nanoparticles was completed. The material was characterized by general methods and the dosage and kinetics of the antioxidant dependent release was measured. Finally, the biological interaction of the material was determined along with TEM measurements. An electron investigation proved that the pore openings of the MSN were indeed blocked by the Fe{sub 3}O{sub 4} nanoparticles. The biological interaction investigation demonstrated Fe{sub 3}O{sub 4}-capped MSN endocytosis into HeLa cells. Not only does the material enter the cells through endocytosis, but it seems that fluorescein was released from the pores most probably caused by disulfide bond reducing molecules, antioxidants. In addition to endocytosis and release, the Fe{sub 3}O{sub 4}-capped MSN propelled the cells across a cuvette upon induction of a magnet force. Finally, an important aspect of materials characterization is transmission electron microscopy. A TEM investigation demonstrated that incorporating different functional groups during the synthesis (co-condensation) changed the particle and pore morphologies.

Brian G. Trewyn

2006-05-01T23:59:59.000Z

99

Microstructure development in particulate coatings examined with high-resolution cryogenic scanning electron microscopy  

SciTech Connect (OSTI)

The authors used cryogenic scanning electron microscopy to examine the early stages of latex film formation. They visualized the influence of ionic strength and extent of carboxylation in latex-calcium carbonate formulations and in latex-only formulations. Results demonstrated that latex particles deposited on calcium carbonate surfaces creating a suspension of carboxylic acid-stabilized calcium carbonate particles. Images of consolidation fronts showed that variation of ionic strength and extent of carboxylation dramatically changes the way latex particles consolidate and form films.

Sheehan, J.G.; Davis, H.T.; Scriven, L.E. [Univ. of Minnesota, Minneapolis, MN (United States); Takamura, Koichi [BASF Corp., Charlotte, NC (United States)

1993-12-01T23:59:59.000Z

100

In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching  

SciTech Connect (OSTI)

An in situ transmission electron microscopy (TEM) analysis of a solid electrolyte, Cu-GeS, during resistance switching is reported. Real-time observations of the filament formation and disappearance process were performed in the TEM instrument and the conductive-filament-formation model was confirmed experimentally. Narrow conductive filaments were formed corresponding to resistance switching from high- to low-resistance states. When the resistance changed to high-resistance state, the filament disappeared. It was also confirmed by use of selected area diffractometry and energy-dispersive x-ray spectroscopy that the conductive filament was made of nanocrystals composed mainly of Cu.

Fujii, Takashi; Arita, Masashi; Takahashi, Yasuo [Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814 (Japan); Fujiwara, Ichiro [Semiconductor Technology Academic Research Center, 3-17-2 Shinyokohama, Kohoku-ku, Yokohama 222-0033 (Japan)

2011-05-23T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


101

Structural defects in GaN revealed by Transmission Electron Microscopy  

SciTech Connect (OSTI)

This paper reviews the various types of structural defects observed by Transmission Electron Microscopy in GaN heteroepitaxial layers grown on foreign substrates and homoepitaxial layers grown on bulk GaN substrates. The structural perfection of these layers is compared to the platelet self-standing crystals grown by High Nitrogen Pressure Solution. Defects in undoped and Mg doped GaN are discussed. Some models explaining the formation of inversion domains in heavily Mg doped layers that are possible defects responsible for the difficulties of p-doping in GaN are also reviewed.

Liliental-Weber, Zuzanna

2014-04-18T23:59:59.000Z

102

An electron microscopy study of the microstructure and microarchitecture of the Strombus gigas shell  

SciTech Connect (OSTI)

A scanning and transmission electron microscopy study is presented of the microstructure of the Strombus gigas shell. The hierarchical nature of this crossed-lamellar structure and the defect content of the mineral component are described. The mineral component consists of small single crystal grains of aragonite, the metastable orthorhombic polymorph of CaCO{sub 3}. The habit and morphology of the grains discussed here have not been determined previously. The observed habit and defect structure suggest that the organic matrix exerts a high degree of control over the crystal growth of the mineral phase and is responsible for the long range order in the microarhitecture. Electron beam heating of the mineral component leads to certain phase changes and these are discussed. 15 refs., 6 figs.

Rieke, P.C.; Laraia, V.J. (Pacific Northwest Lab., Richland, WA (USA)); Heuer, A.H. (Case Western Reserve Univ., Cleveland, OH (USA)); Aindow, M. (Ohio State Univ., Columbus, OH (USA))

1989-11-01T23:59:59.000Z

103

Hetero-epitaxial EuO interfaces studied by analytic electron microscopy  

SciTech Connect (OSTI)

With nearly complete spin polarization, the ferromagnetic semiconductor europium monoxide could enable next-generation spintronic devices by providing efficient ohmic spin injection into silicon. Spin injection is greatly affected by the quality of the interface between the injector and silicon. Here, we use atomic-resolution scanning transmission electron microscopy in conjunction with electron energy loss spectroscopy to directly image and chemically characterize a series of EuO|Si and EuO|YAlO{sub 3} interfaces fabricated using different growth conditions. We identify the presence of europium silicides and regions of disorder at the EuO|Si interfaces, imperfections that could significantly reduce spin injection efficiencies via spin-flip scattering.

Mundy, Julia A. [School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853 (United States); Hodash, Daniel; Melville, Alexander; Held, Rainer [Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853 (United States); Mairoser, Thomas; Schmehl, Andreas [Zentrum fr Elektronische Korrelationen und Magnetismus, Universitt Augsburg, Universittsstrae 1, D-86159 Augsburg (Germany); Muller, David A.; Kourkoutis, Lena F. [School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853 (United States); Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853 (United States); Schlom, Darrell G. [Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853 (United States); Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853 (United States)

2014-03-03T23:59:59.000Z

104

Transmission Electron Microscopy Study of Eu-Doped Y2O3 Nanosheets and Nanotubes  

SciTech Connect (OSTI)

A hydrothermal method was used to synthesize high-purity Eu-doped Y{sub 2}O{sub 3} nanosheets and nanotubes with an approximate molar ratio of (0.1):(1.0) for Eu:Y. High-resolution transmission electron microscopy, energy dispersive X-ray spectroscopy analysis and synchrotron X-ray diffraction were used to characterize these nanomaterials. A body-centered cubic structure was confirmed for the nanotubes. The lattice parameter of Eu-doped Y{sub 2}O{sub 3} nanotubes were 0.12% larger as compared to that of pure Y{sub 2}O{sub 3} which was attributed to the larger ionic radius of Eu{sup 3+} (0.947 {angstrom}) than that of Y{sup 3+} (0.900 {angstrom}). The nanosheets had a similar structure. Nanosheets of approximate dimensions 600 to 800 nm length and width were obtained using a slightly lower pH value, and they were highly textured. The high resolution transmission electron microscopy images showed that the nanotubes are fully crystalline. The nanotubes were typically 1.5-3 {micro}m in length and 50-200 nm in diameter. Using a pH value of approximately 10, stable nanotubes were obtained. It is anticipated that nanosheets might have rolled to form more stable nanotubes.

H Sun; T Chaudhuri; E Kenik; H Zhu; Y Ma

2011-12-31T23:59:59.000Z

105

Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy  

SciTech Connect (OSTI)

Observation of growth, synthesis, dynamics and electrochemical reactions in the liquid state is an important yet largely unstudied aspect of nanotechnology. The only techniques that can potentially provide the insights necessary to advance our understanding of these mechanisms is simultaneous atomic-scale imaging and quantitative chemical analysis (through spectroscopy) under environmental conditions in the transmission electron microscope (TEM). In this study we describe the experimental and technical conditions necessary to obtain electron energy loss (EEL) spectra from a nanoparticle in colloidal suspension using aberration corrected scanning transmission electron microscopy (STEM) combined with the environmental liquid stage. At a fluid path length below 400 nm, atomic resolution images can be obtained and simultaneous compositional analysis can be achieved. We show that EEL spectroscopy can be used to quantify the total fluid path length around the nanoparticle, and demonstrate characteristic core-loss signals from the suspended nanoparticles can be resolved and analyzed to provide information on the local interfacial chemistry with the surrounding environment. The combined approach using aberration corrected STEM and EEL spectra with the in situ fluid stage demonstrates a plenary platform for detailed investigations of solution based catalysis and biological research.

Jungjohann, K. L.; Evans, James E.; Aguiar, Jeff; Arslan, Ilke; Browning, Nigel D.

2012-06-04T23:59:59.000Z

106

Characterization of polysilicon films by Raman spectroscopy and transmission electron microscopy: A comparative study  

SciTech Connect (OSTI)

Samples of chemically-vapor-deposited micrometer and sub-micrometer-thick films of polysilicon were analyzed by transmission electron microscopy (TEM) in cross-section and by Raman spectroscopy with illumination at their surface. TEM and Raman spectroscopy both find varying amounts of polycrystalline and amorphous silicon in the wafers. Raman spectra obtained using blue, green and red excitation wavelengths to vary the Raman sampling depth are compared with TEM cross-sections of these films. Films showing crystalline columnar structures in their TEM micrographs have Raman spectra with a band near 497 cm{sup {minus}1} in addition to the dominant polycrystalline silicon band (521 cm{sup {minus}1}). The TEM micrographs of these films have numerous faulted regions and fringes indicative of nanometer-scale silicon structures, which are believed to correspond to the 497cm{sup {minus}1} Raman band.

Tallant, D.R.; Headley, T.J.; Medernach, J.W. [Sandia National Labs., Albuquerque, NM (United States); Geyling, F. [SEMATECH, Austin, TX (United States)

1993-11-12T23:59:59.000Z

107

Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam  

Science Journals Connector (OSTI)

A novel scheme is presented for the preparation of cross?section transmission electron microscopy(TEM) specimens with a focused ion beam(FIB). This scheme is particularly suitable for highly structured substrates such as integrated circuits. The specimen is made by cutting a thin slice of material from the substrate by sputtering with the FIB. The position of the specimen can be selected with submicron resolution. The specimen is subsequently removed from the substrate and transported to a standard TEM?specimen holder. A specimen ready for TEM inspection can be prepared within 2 hs. The samples are of excellent quality as is illustrated with cross?section TEM images of FIB?made specimens of an electrically programmable read?only memory.

M. H. F. Overwijk; F. C. van den Heuvel; C. W. T. Bulle?Lieuwma

1993-01-01T23:59:59.000Z

108

Advances in cryogenic transmission electron microscopy for the characterization of dynamic self-assembling nanostructures  

Science Journals Connector (OSTI)

Elucidating the structural information of nanoscale materials in their solvent-exposed state is crucial, as a result, cryogenic transmission electron microscopy (cryo-TEM) has become an increasingly popular technique in the materials science, chemistry, and biology communities. Cryo-TEM provides a method to directly visualize the specimen structure in a solution-state through a thin film of vitrified solvent. This technique complements X-ray, neutron, and light scattering methods that probe the statistical average of all species present; furthermore, cryo-TEM can be used to observe changes in structure over time. In the area of self-assembly, this tool has been particularly powerful for the characterization of natural and synthetic small molecule assemblies, as well as hybrid organicinorganic composites. In this review, we discuss recent advances in cryogenic TEM in the context of self-assembling systems with emphasis on characterization of transitions observed in response to external stimuli.

Christina J. Newcomb; Tyson J. Moyer; Sungsoo S. Lee; Samuel I. Stupp

2012-01-01T23:59:59.000Z

109

Transmission electron microscopy of oxide dispersion strengthened (ODS) molybdenum: effects of irradiation on material microstructure  

SciTech Connect (OSTI)

Oxide dispersion strengthened (ODS) molybdenum has been characterized using transmission electron microscopy (TEM) to determine the effects of irradiation on material microstructure. This work describes the results-to-date from TEM characterization of unirradiated and irradiated ODS molybdenum. The general microstructure of the unirradiated material consists of fine molybdenum grains (< 5 {micro}m average grain size) with numerous low angle boundaries and isolated dislocation networks. 'Ribbon'-like lanthanum oxides are aligned along the working direction of the product form and are frequently associated with grain boundaries, serving to inhibit grain boundary and dislocation movement. In addition to the 'ribbons', discrete lanthanum oxide particles have also been detected. After irradiation, the material is characterized by the presence of nonuniformly distributed large ({approx} 20 to 100 nm in diameter), multi-faceted voids, while the molybdenum grain size and oxide morphology appear to be unaffected by irradiation.

Baranwal, R. and Burke, M.G.

2003-03-03T23:59:59.000Z

110

Rendering graphene supports hydrophilic with non-covalent aromatic functionalization for transmission electron microscopy  

SciTech Connect (OSTI)

Amorphous carbon films have been routinely used to enhance the preparation of frozen-hydrated samples for transmission electron microscopy (TEM), either in retaining protein concentration, providing mechanical stability or dissipating sample charge. However, strong background signal from the amorphous carbon support obstructs that of the sample, and the insulating properties of thin amorphous carbon films preclude any efficiency in dispersing charge. Graphene addresses the limitations of amorphous carbon. Graphene is a crystalline material with virtually no phase or amplitude contrast and unparalleled, high electrical carrier mobility. However, the hydrophobic properties of graphene have prevented its routine application in Cryo-TEM. This Letter reports a method for rendering graphene TEM supports hydrophilica convenient approach maintaining graphene's structural and electrical properties based on non-covalent, aromatic functionalization.

Pantelic, Radosav S., E-mail: pantelic@imbb.forth.gr [National Cancer Institute, 50 South Drive, Building 50, Room 4306, Bethesda, Maryland 20892 (United States); Fu, Wangyang; Schoenenberger, Christian [Department of Physics, University of Basel, Klingelbergstrasse 82, Basel CH-4056 (Switzerland); Stahlberg, Henning [Center for Cellular Imaging and NanoAnalytics, Biozentrum, University of Basel, Mattenstrasse 26, WRO-1058, Basel CH-4058 (Switzerland)

2014-03-31T23:59:59.000Z

111

Microstructural development in PWA-1480 electron beam welds: An atom probe field ion microscopy study  

SciTech Connect (OSTI)

The microstructure development in PWA-1480 superalloy electron beam weld (Ni-11.0 at. % Al-11.5% Cr-1.9% Ti-5.1% Co-4.0% Ta-1.3% W) was characterized. Optical microscopy revealed a branched dendritic structure in the weld metal. Transmission electron microscopy of these welds, in the as-welded condition, showed fine cuboidal (0.05--0.5 {mu}m) L1{sub 2}-ordered {gamma}{prime} precipitates within the y grains. The average volume percentage of {gamma}{prime} precipitates was found to be {approx}5%. Atom probe analyses revealed that the composition of {gamma} matrix was Ni-4.6 at. % Al-25.5% Cr-0.4% Ti-9.4% Co-0.8% Ta-2.9% W and that of {gamma}{prime} precipitates was Ni-17.3 at. % Al-2.6% Cr-2.4% Ti-3.0% Co-7.4% Ta-1.3% W. These compositions were compared with the previous APFIM analyses of commercial PWA-1480 single crystals that had received conventional heat treatments. Small differences were found in the chromium and aluminum levels and these may be due to the nonequilibrium nature of phase transformations that occur during weld cooling. No solute segregation was detected at the {gamma}-{gamma}{prime}interface. The APFIM results were also compared with the thermodynamic calculations of alloying element partitioning between {gamma} and {gamma}{prime} using the ThermoCalc{trademark} software.

David, S.A.; Miller, M.K. [Oak Ridge National Lab., TN (United States); Babu, S.S. [The Pennsylvania State Univ., State College, PA (United States)

1995-12-31T23:59:59.000Z

112

Scanning electron microscopy and electron probe microanalyses of the crystalline components of human and animal dental calculi  

SciTech Connect (OSTI)

A review of the use of scanning electron microscopy (SEM) and electron probe microanalyses in the study of dental calculus showed that such studies provided confirmatory and supplementary data on the morphological features of human dental calculi but gave only limited information on the identity of the crystalline or inorganic components. This study aimed to explore the potential of combined SEM and microanalyses in the identification of the crystalline components of the human and animal dental calculi. Human and animal calculi were analyzed. Identification of the crystalline components were made based on the combined information of the morphology (SEM) and Ca/P molar ratios of the crystals with the morphology and Ca/P molar ratio of synthetic calcium phosphates (brushite or DCPD; octacalcium phosphate, OCP; Mg-substituted whitlockite, beta-TCMP; CO/sub 3/-substituted apatite, (CHA); and calcite. SEM showed similarities in morphological features of human and animal dental calculi but differences in the forms of crystals present. Microanalyses and crystal morphology data suggested the presence of CaCO/sub 3/ (calcite) and CHA in the animal (cat, dog, tiger) and of OCP, beta-TCMP and CHA in human dental calculi. X-ray diffraction and infrared (IR) absorption analyses confirmed these results. This exploratory study demonstrated that by taking into consideration what is known about the crystalline components of human and animal dental calculi, combined SEM and microanalyses can provide qualitative identification.

LeGeros, R.Z.; Orly, I.; LeGeros, J.P.; Gomez, C.; Kazimiroff, J.; Tarpley, T.; Kerebel, B.

1988-03-01T23:59:59.000Z

113

Chuaria circularis from the early Mesoproterozoic Suket Shale, Vindhyan Supergroup, India: Insights from light and electron microscopy and pyrolysis-gas chromatography  

Science Journals Connector (OSTI)

Chuaria circularis (Walcott 1899) from the Suket Shale of the Vindhyan Supergroup (central India) ... composition using biostatistics, electron microscopy and pyrolysis-gas chromatography. Morpho...

Suryendu Dutta; Michael Steiner; Santanu Banerjee

2006-02-01T23:59:59.000Z

114

Low-temperature scanning tunneling microscopy and transport measurements on adsorbate-induced two-dimensional electron systems  

SciTech Connect (OSTI)

We have performed not only magnetotransport measurements on two-dimensional electron systems (2DESs) formed at the cleaved surfaces of p-InAs but also observations of the surface morphology of the adsorbate atoms, which induced the 2DES at the surfaces of narrow band-gap semiconductors, with use of a scanning tunneling microscopy. The electron density of the 2DESs is compared to the atomic density of the isolated Ag adatoms on InAs surfaces.

Masutomi, Ryuichi; Triyama, Naotaka; Okamoto, Tohru [Department of Physics, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

2013-12-04T23:59:59.000Z

115

Detecting Cellulase Penetration Into Corn Stover Cell Walls by Immuno-Electron Microscopy  

SciTech Connect (OSTI)

In general, pretreatments are designed to enhance the accessibility of cellulose to enzymes, allowing for more efficient conversion. In this study, we have detected the penetration of major cellulases present in a commercial enzyme preparation (Spezyme CP) into corn stem cell walls following mild-, moderate- and high-severity dilute sulfuric acid pretreatments. The Trichoderma reesei enzymes, Cel7A (CBH I) and Cel7B (EG I), as well as the cell wall matrix components xylan and lignin were visualized within digested corn stover cell walls by immuno transmission electron microscopy (TEM) using enzyme- and polymer-specific antibodies. Low severity dilute-acid pretreatment (20 min at 100 C) enabled <1% of the thickness of secondary cell walls to be penetrated by enzyme, moderate severity pretreatment at (20 min at 120 C) allowed the enzymes to penetrate {approx}20% of the cell wall, and the high severity (20 min pretreatment at 150 C) allowed 100% penetration of even the thickest cell walls. These data allow direct visualization of the dramatic effect dilute-acid pretreatment has on altering the condensed ultrastructure of biomass cell walls. Loosening of plant cell wall structure due to pretreatment and the subsequently improved access by cellulases has been hypothesized by the biomass conversion community for over two decades, and for the first time, this study provides direct visual evidence to verify this hypothesis. Further, the high-resolution enzyme penetration studies presented here provide insight into the mechanisms of cell wall deconstruction by cellulolytic enzymes.

Donohoe, B. S.; Selig, M. J.; Viamajala, S.; Vinzant, T. B.; Adney, W. S.; Himmel, M. E.

2009-06-15T23:59:59.000Z

116

TRANSMISSION ELECTRON MICROSCOPY OF Al-RICH SILICATE STARDUST FROM ASYMPTOTIC GIANT BRANCH STARS  

SciTech Connect (OSTI)

We report on transmission electron microscopy (TEM) investigations of two mineralogically unusual stardust silicates to constrain their circumstellar condensation conditions. Both grains were identified by high spatial resolution nano secondary ion mass spectrometry (NanoSIMS) in the Acfer 094 meteorite, one of the most pristine carbonaceous chondrites available for study. One grain is a highly crystalline, highly refractory (Fe content < 0.5 at%), structurally undisturbed orthopyroxene (MgSiO{sub 3}) with an unusually high Al content (1.8 {+-} 0.5 at%). This is the first TEM documentation of a single crystal pyroxene within the complete stardust silicate data set. We interpret the microstructure and chemistry of this grain as being a direct condensate from a gas of locally non-solar composition (i.e., with a higher-than-solar Al content and most likely also a lower-than-solar Mg/Si ratio) at (near)-equilibrium conditions. From the overabundance of crystalline olivine (six reported grains to date) compared to crystalline pyroxene (only documented as a single crystal in this work) we infer that formation of olivine over pyroxene is favored in circumstellar environments, in agreement with expectations from condensation theory and experiments. The second stardust silicate consists of an amorphous Ca-Si rich material which lacks any crystallinity based on TEM observations in which tiny (<20 nm) hibonite nanocrystallites are embedded. This complex assemblage therefore attests to the fast cooling and rapidly changing chemical environments under which dust grains in circumstellar shells form.

Vollmer, Christian [Institute for Mineralogy, University of Muenster, Correnssstr. 24, D-48149 Muenster (Germany); Hoppe, Peter [Max Planck Institute for Chemistry, Particle Chemistry Department, Hahn-Meitner-Weg 1, D-55128 Mainz (Germany); Brenker, Frank E., E-mail: christian.vollmer@wwu.de [Institute of Geoscience/Mineralogy, Goethe-University Frankfurt, Altenhoeferallee 1, D-60438 Frankfurt (Germany)

2013-05-20T23:59:59.000Z

117

Characterization of plutonium-bearing wastes by chemical analysis and analytical electron microscopy  

SciTech Connect (OSTI)

This report summarizes the results of characterization studies of plutonium-bearing wastes produced at the US Department of Energy weapons production facilities. Several different solid wastes were characterized, including incinerator ash and ash heels from Rocky Flats Plant and Los Alamos National Laboratory; sand, stag, and crucible waste from Hanford; and LECO crucibles from the Savannah River Site. These materials were characterized by chemical analysis and analytical electron microscopy. The results showed the presence of discrete PuO{sub 2}PuO{sub 2{minus}x}, and Pu{sub 4}O{sub 7} phases, of about 1{mu}m or less in size, in all of the samples examined. In addition, a number of amorphous phases were present that contained plutonium. In all the ash and ash heel samples examined, plutonium phases were found that were completely surrounded by silicate matrices. Consequently, to achieve optimum plutonium recovery in any chemical extraction process, extraction would have to be coupled with ultrafine grinding to average particle sizes of less than 1 {mu}m to liberate the plutonium from the surrounding inert matrix.

Behrens, R.G. [Los Alamos National Lab., NM (United States); Buck, E.C.; Dietz, N.L.; Bates, J.K.; Van Deventer, E.; Chaiko, D.J. [Argonne National Lab., IL (United States)

1995-09-01T23:59:59.000Z

118

Thermodynamic Prediction of Compositional Phases Confirmed by Transmission Electron Microscopy on Tantalum-Based Alloy Weldments  

SciTech Connect (OSTI)

Tantalum alloys have been used by the U.S. Department of Energy as structural alloys for radioisotope based thermal to electrical power systems since the 1960s. Tantalum alloys are attractive for high temperature structural applications due to their high melting point, excellent formability, good thermal conductivity, good ductility (even at low temperatures), corrosion resistance, and weldability. Tantalum alloys have demonstrated sufficient high-temperature toughness to survive prolonged exposure to the radioisotope power-system working environment. Typically, the fabrication of power systems requires the welding of various components including the structural members made of tantalum alloys. Issues such as thermodynamics, lattice structure, weld pool dynamics, material purity and contamination, and welding atmosphere purity all potentially confound the understanding of the differences between the weldment properties of the different tantalum-based alloys. The objective of this paper is to outline the thermodynamically favorable material phases in tantalum alloys, with and without small amounts of hafnium, during and following solidification, based on the results derived from the FactSage(c) Integrated Thermodynamic Databank. In addition, Transition Electron Microscopy (TEM) data will show for the first time, the changes occurring in the HfC before and after welding, and the data will elucidate the role HfC plays in pinning grain boundaries.

Moddeman, William E.; Birkbeck, Janine C. [BWXT Pantex, Amarillo, Texas 79120-0020 (United States); Barklay, Chadwick D.; Kramer, Daniel P. [University of Dayton Research Institute, Dayton OH 45469-0102 (United States); Miller, Roger G.; Allard, Lawrence F. [Oak Ridge National Laboratory, Oak Ridge, TN 37831-6064 (United States)

2007-01-30T23:59:59.000Z

119

Transmission electron microscopy and Monte Carlo simulations of ordering in Au-Cu clusters produced in a laser vaporization source  

Science Journals Connector (OSTI)

Au-Cu bimetallic alloy clusters are produced in a laser vaporization source starting from Au-Cu alloy targets with different stoichiometric compositions. The clusters are deposited on two different substratesamorphous carbon and crystalline MgOand are characterized by electron diffraction and high-resolution electron microscopy. The experiments show that the overall chemical composition in the clusters is the same as the chemical composition of the target material; but the crystal structure of the Au-Cu alloy clusters differs from their known bulk crystal structure. Electron microscopy experiments provide evidence that no chemical ordering exists between Au and Cu atoms and that the clusters are solid solutions. Monte Carlo simulations using the second moment tight-binding approximation, however, predict Cu3Au clusters ordered in the core but with a disordered mantle. The possible origins of the differences between experiment and Monte Carlo simulations are discussed.

B. Pauwels; G. Van Tendeloo; E. Zhurkin; M. Hou; G. Verschoren; L. Theil Kuhn; W. Bouwen; P. Lievens

2001-03-27T23:59:59.000Z

120

SCANNING ELECTRON MICROSCOPY AND X-RAY DIFFRACTION ANALYSIS OF TANK 18 SAMPLES  

SciTech Connect (OSTI)

The F-Area Tank Farm (FTF) Performance Assessment (PA) utilizes waste speciation in the waste release model used in the FTF fate and transport modeling. The waste release modeling associated with the residual plutonium in Tank 18 has been identified as a primary contributor to the Tank 18 dose uncertainty. In order to reduce the uncertainty related to plutonium in Tank 18, a better understanding of the plutonium speciation in the Tank 18 waste (including the oxidation state and stoichiometry) is desired. Savannah River National Laboratory (SRNL) utilized Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to analyze Tank 18 samples to provide information on the speciation of plutonium in the waste material. XRD analysis of the Tank 18 samples did not identify any plutonium mineral phases in the samples. These indicates the crystalline mineral phases of plutonium are below the detection limits of the XRD method or that the plutonium phase(s) lack long range order and are present as amorphous or microcrystalline solids. SEM analysis of the Tank 18 samples did locate particles containing plutonium. The plutonium was found as small particles, usually <1 {micro}m but ranging up to several micrometers in diameter, associated with particles of an iron matrix and at low concentration in other elemental matrices. This suggests the plutonium has an affinity for the iron matrix. Qualitatively, the particles of plutonium found in the SEM analysis do not appear to account for all of the plutonium in the sample based on concentrations determined from the chemical analysis of the Tank 18 samples. This suggests that plutonium is also distributed throughout the solids in low concentrations.

Hay, M.; O'Rourke, P.; Ajo, H.

2012-03-08T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


121

Electronic properties of the Ga vacancy in GaP(110) surfaces determined by scanning tunneling microscopy  

Science Journals Connector (OSTI)

The electronic properties of uncharged Ga monovacancies in GaP(110) surfaces are determined from voltage-dependent scanning tunneling microscopy images. The signatures of localized defect states in the band gap are analyzed and their spatial location is determined. Empty and occupied defect states exist. Depressed dangling bonds in the occupied-state images indicate an inward relaxation of the neighboring P atoms. The results agree with recent theoretical work.

Ph. Ebert and K. Urban

1998-07-15T23:59:59.000Z

122

Demonstration of Ballistic Electron Emission Microscopy / Spectroscopy on the Au/Si (001) system  

E-Print Network [OSTI]

microscopy; hence, the analytical capabilities of BEEM are on a manometer scale. To use BEEM, low-noise Au/Si (001) Schottky diodes have been fabricated. The diodes were macroscopically tested for their electrical properties using conventional current...

Drummond, Mary Alyssa

2012-06-07T23:59:59.000Z

123

Probing the electronic structure of graphene sheets with various thicknesses by scanning transmission X-ray microscopy  

SciTech Connect (OSTI)

The electronic structure of an aggregation of graphene sheets with various thicknesses was probed by scanning transmission X-ray microscopy. A uniform oxidation of the graphene sheets in the flat area was observed regardless of the thickness, while in the folded area the result could be strongly affected by the geometry. Moreover, thick parts of the aggregation showed strong angle-dependence to the incident X-ray, while thin parts showed less angle-dependence, which might be related to the surface wrinkles and ripples. The electronic structure differences due to the geometry and thickness suggest a complicated situation in the aggregation of graphene sheets.

Bai, Lili; Liu, Jinyin; Zhao, Guanqi; Gao, Jing; Sun, Xuhui, E-mail: xhsun@suda.edu.cn, E-mail: jzhong@suda.edu.cn; Zhong, Jun, E-mail: xhsun@suda.edu.cn, E-mail: jzhong@suda.edu.cn [Soochow University-Western University Centre for Synchrotron Radiation Research, Institute of Functional Nano and Soft Materials Laboratory (FUNSOM) and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123 (China)] [Soochow University-Western University Centre for Synchrotron Radiation Research, Institute of Functional Nano and Soft Materials Laboratory (FUNSOM) and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123 (China)

2013-12-16T23:59:59.000Z

124

Mapping the Valence States of Transition-Metal Elements Using Energy-Filtered Transmission Electron Microscopy  

E-Print Network [OSTI]

spectrum of MnO2 acquired at 200 kV using a Hitachi HF-2000 transmission electron microscope equipped lines observed in electron energy-loss spectroscopy in a transmission electron microscope (TEMMapping the Valence States of Transition-Metal Elements Using Energy-Filtered Transmission Electron

Wang, Zhong L.

125

High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy  

Science Journals Connector (OSTI)

...equal to the beam current per unit area per unit solid angle per unit energy interval, CFE electron sources with their...Monochromated, spatially resolved electron energy-loss spectroscopic measurements of gold nanoparticles in the plasmon range...

2009-01-01T23:59:59.000Z

126

High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy  

Science Journals Connector (OSTI)

...R. F. 1996 Electron energy-loss spectroscopy in...microscope, 2nd edn. New York, NYPlenum. Egerton...Transmission electron energy loss spectrometry in materials...energy-gain spectroscopy. New J. Phys. 10, 1367-2630...

2009-01-01T23:59:59.000Z

127

Microstructure of highly strained BiFeO{sub 3} thin films: Transmission electron microscopy and electron-energy loss spectroscopy studies  

SciTech Connect (OSTI)

Microstructure and electronic structure of highly strained bismuth ferrite (BiFeO{sub 3}) thin films grown on lanthanum aluminate substrates are studied using high-resolution transmission and scanning transmission electron microscopies and electron energy loss spectroscopy (EELS). Monoclinic and tetragonal phases were observed in films grown at different temperatures, and a mix of both phases was detected in a film grown at intermediate temperature. In this film, a smooth transition of the microstructure was found between the monoclinic and the tetragonal phases. A considerable increase in the c-axis parameters was observed in both phases compared with the rhombohedral bulk phase. The off-center displacement of iron (Fe) ions was increased in the monoclinic phase as compared with the tetragonal phase. EEL spectra show different electronic structures in the monoclinic and the tetragonal phases. These experimental observations are well consistent with the results of theoretical first-principle calculations performed.

Heon Kim, Young, E-mail: young.h.kim@kriss.re.kr [Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Germany); Korea Research Institute of Standards and Science (KRISS), Daejeon 305-340 (Korea, Republic of); Bhatnagar, Akash; Pippel, Eckhard; Hesse, Dietrich [Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Germany); Alexe, Marin [Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Germany); University of Warwick, Coventry CV4 7AL, West Midlands (United Kingdom)

2014-01-28T23:59:59.000Z

128

In situ electron microscopy study of growth of WO3 and MoO3 nanowhiskers  

Science Journals Connector (OSTI)

WO3 and MoO3 nanowhiskers were grown from nanosize WO3 and MoO3 powders intensely irradiated with electrons in an electron microscope. Solid and hollow nanowhiskers of these materials were observed. A growth mech...

1 R. T. Malkhasyan; R. K. Karakhanyan; M. N. Nazaryan

2003-05-01T23:59:59.000Z

129

New views of materials through aberration-corrected scanning transmission electron microscopy  

Science Journals Connector (OSTI)

......analysis to solving energy problems. Phil...eds. (2007) New York: Springer...and electron energy loss spectroscopy...eds. (2011) New York: Springer...for electron energy loss spectroscopy...can now give new insights into......

S. J. Pennycook; M. Varela

2011-08-01T23:59:59.000Z

130

Application of electron microscopy and x-ray structural analysis for the determination of sizes of structural elements in nanocrystalline materials (Review)  

Science Journals Connector (OSTI)

The possibilities of determining the sizes of structural elements in various nanocrystalline materials by electron microscopy and X-ray structural analysis are analyzed. It is shown that these sizes depend on ...

Yu. D. Yagodkin; S. V. Dobatkin

2008-12-01T23:59:59.000Z

131

Studying Fischer-Tropsch catalysts using transmission electron microscopy and model systems of nanoparticles on planar supports.  

SciTech Connect (OSTI)

Nanoparticle model systems on planar supports form a versatile platform for studying morphological and compositional changes of catalysts due to exposure to realistic reaction conditions. We review examples from our work on iron and cobalt catalysts, which can undergo significant rearrangement in the reactive environment of the Fischer-Tropsch synthesis. The use of specially designed, silicon based supports with thin film SiO{sub 2} enables the application of transmission electron microscopy, which has furnished important insight into e.g. the mechanisms of catalyst regeneration.

Thune, P. C.; Weststrate, C. J.; Moodley, P.; Saib, A. M.; van de Loosdrecht, J.; Miller, J. T.; Niemantsverdriet, J. W. (Chemical Sciences and Engineering Division); (Eindhoven Univ. of Technology); (Sasol Technology)

2011-01-01T23:59:59.000Z

132

Reflection Electron Microscopy and Spectroscopy for Surface Analysis Georgia Institute of Technology  

E-Print Network [OSTI]

.4 Fourier transformation 1.5 Scattering factor and charge density function 1.6 Single scattering theory 1 Historical background Scope of the book Chapter 1. Kinematical electron diffraction 1.1 Electron wavelength 1.7 Reciprocal space and reciprocal lattice vector 1.8 Bragg's law and Ewald sphere 1.9 Abbe's imaging theory 1

Wang, Zhong L.

133

The Thirty-fifth Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......ment of a magnetic sector type electron energy...Ltd., Kyoto Design, construction and performance test...qhtp) by further heating with the stronger electron...and c = 30.1 A. The space group of the crystal...the model in which the construction rule on the U-W connection......

The Thirty-fifth Annual Meeting of the Japanese Society of Electron Microscopy

1979-01-01T23:59:59.000Z

134

The Thirty-seventh Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......beam from a hairpin cathode electron gun. A...fer- romagnetic materials I. Magnetic domain...Geoclemmys in an active state, small specific...electron-translucent material (Type II), were...Japan and **Tokyo Cathode Lab. Co., Ltd...and fuel cladding material due to thermal and......

Morris J. KARNOVSKY

1981-01-01T23:59:59.000Z

135

Laboratory-Based Cryogenic Soft X-ray Tomography with Correlative Cryo-Light and Electron Microscopy  

SciTech Connect (OSTI)

Here we present a novel laboratory-based cryogenic soft X-ray microscope for whole cell tomography of frozen hydrated samples. We demonstrate the capabilities of this compact cryogenic microscope by visualizing internal sub-cellular structures of Saccharomyces cerevisiae cells. The microscope is shown to achieve better than 50 nm spatial resolution with a Siemens star test sample. For whole biological cells, the microscope can image specimens up to 5 micrometers thick. Structures as small as 90 nm can be detected in tomographic reconstructions at roughly 70 nm spatial resolution following a low cumulative radiation dose of only 7.2 MGy. Furthermore, the design of the specimen chamber utilizes a standard sample support that permits multimodal correlative imaging of the exact same unstained yeast cell via cryo-fluorescence light microscopy, cryo-soft x-ray microscopy and cryo-transmission electron microscopy. This completely laboratory-based cryogenic soft x-ray microscope will therefore enable greater access to three-dimensional ultrastructure determination of biological whole cells without chemical fixation or physical sectioning.

Carlson, David B.; Gelb, Jeff; Palshin, Vadim; Evans, James E.

2013-02-01T23:59:59.000Z

136

A Laves phase-body-centered cubic structural relationship determined using high voltage electron microscopy  

SciTech Connect (OSTI)

High energy electron and ion irradiation of a TiCr{sub 2} Laves compound were found previously to result in a transformation to a body-centered cubic (bcc) solid solution. In the case of electron irradiation, the precipitating bcc phase exhibits preferential crystallographic orientation with respect to the initial compound crystal for irradiation temperatures above 200 K. This article presents an analysis of the electron diffraction data gathered in the course of the electron irradiation-induced Laves phase to bcc transformation in TiCr{sub 2}. A structural relationship between the bcc and Laves compound crystal lattices is determined which can account for all observations of preferentially oriented bcc precipitates. The significance of this mechanism for transformations between bcc and the Laves phases is discussed. In addition, the possible significance for deformation mechanisms of the Laves compounds is explored.

Sinkler, W. [GKSS Forschungszentrum, Geesthacht (Germany). Inst. fuer Werkstofforschung] [GKSS Forschungszentrum, Geesthacht (Germany). Inst. fuer Werkstofforschung

1996-04-01T23:59:59.000Z

137

Electron microscopy of GaAs/AlGaAs quantum cascade laser  

Science Journals Connector (OSTI)

The quantum cascade laser (QCL) is based on a different principle comparing to bipolar semiconductor lasers, because it uses only one type of ... electrons and therefore is called an unipolar laser.

A. ?aszcz; J. Ratajczak; A. Czerwinski

2008-01-01T23:59:59.000Z

138

The Reactivity and Structural Dynamics of Supported Metal Nanoclusters Using Electron Microscopy, in situ X-Ray Spectroscopy, Electronic Structure Theories, and Molecular Dynamics Simulations.  

SciTech Connect (OSTI)

The distinguishing feature of our collaborative program of study is the focus it brings to emergent phenomena originating from the unique structural/electronic environments found in nanoscale materials. We exploit and develop frontier methods of atomic-scale materials characterization based on electron microscopy (Yang) and synchrotron X-ray absorption spectroscopy (Frenkel) that are in turn coupled innately with advanced first principles theory and methods of computational modeling (Johnson). In the past year we have made significant experimental advances that have led to important new understandings of the structural dynamics of what are unquestionably the most important classes of heterogeneous catalyststhe materials used to both produce and mitigate the consequences of the use of liquid hydrocarbon fuels.

Judith C. Yang; Ralph G. Nuzzo, Duane Johnson, Anatoly Frenkel

2008-07-01T23:59:59.000Z

139

The Thirty-seventh Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......of metals such as Ta, Zr, Hf, Nb and Ti. As a hydrocarbon...was examined from electron, laser and computer diffrac- tograms...TEM findings disclosed the fusion of PC with MGC in as- sociation...cholesterol during mem- brane fusion at early stage of exocytosis......

Morris J. KARNOVSKY

1981-01-01T23:59:59.000Z

140

The Forty-sixth Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......completed, specimens are trimed with an air turbine bur or a dianond disk in a cold buffer...been developed to improve the detection efficiency. Needless to say, hard X-ray apertures...detection of DQE%1 is realized. 3)High efficiency collection of elastically scattered electrons......

Harunori ISHIKAWA

1990-08-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


141

The Forty-sixth Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......possible roles in nuclear events. 17a-B-MSl...membrane. 17a-B-MS2 Energy distribution of electron...K1r1tan1 Department of Nuclear Engineering, School...defects, 3) Threshold energy for displacement...Klnoshita, Department of Nuclear Engineering, Kyushu...the effect of low energy primary knock-on......

Harunori ISHIKAWA

1990-08-01T23:59:59.000Z

142

THE THIRTY-THIRD ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......seen between the lamellae of the inner bulb. Axons were directly invested with collagenous...were found among them. These findings led us to conclude that efferent nerve fibers...influence of reflected electrons, a non- fluorescent acrylic sheet was stuck on the receiving......

The Thirty-third Annual Meeting of the Japanese Society of Electron Microscopy

1977-01-01T23:59:59.000Z

143

Structural Transformations in self-assembled Semiconductor Quantum Dots as inferred by Transmission Electron Microscopy  

E-Print Network [OSTI]

electronic and optoelectronic devices.1-3 ZnO is a promising material for UV optoelectronics due to its of the results have been widely reproduced or resulted in stable optoelectronic devices. p-type ZnO NWs have also

Moeck, Peter

144

The Thirty-seventh Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......stain and weakly posi- tive in PAS, Sudan B and Luxol Fast Blue. Electron microscopically...type. In these experiments, in situ thermal stability of dislocations, phase transformation...fuel and fuel cladding material due to thermal and fast neutrons. For obtaining examina......

Morris J. KARNOVSKY

1981-01-01T23:59:59.000Z

145

TWENTIETH SCIENTIFIC MEETING OF THE JAPANESE SOCIETY OF ELECTRON-MICROSCOPY:  

Science Journals Connector (OSTI)

......two hours after incoulation elementary bodies 0.3-0.5/* in...similar to viral replication. Elementary bodies seem to result from...membrane has a high degree of resistance against electron bom- bardment...Shinagawa-ku Tokyo There are electric-chemical and physical-chemi......

Twentieth Scientific Meeting of the Japanese Society of Electron-Microscopy: Held at Tokushima University; May 16; 17; 1964

1964-01-01T23:59:59.000Z

146

Development of the program EOD for design in electron and ion microscopy  

Science Journals Connector (OSTI)

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

J. Zlmal; B. Lencov

2011-01-01T23:59:59.000Z

147

Analytical electron microscopy examination of solid reaction products in long-term test of SRL 200 waste glasses  

SciTech Connect (OSTI)

Alteration phases, found on the leached surfaces and present as colloids in the leachates of 200-based frit (fully active and simulated) nuclear waste glass, reacted under static test conditions, at a surface area to leachate volume ratio of 20,000 m{sup {minus}1} for 15 days to 728 days, have been examined by analytical electron microscopy. The compositions of the secondary phases were determined using x-ray energy dispersive spectroscopy and electron energy loss spectroscopy, and structural analysis was accomplished by electron diffraction. Long-term samples of simulated glass, which had undergone an acceleration of reaction after 182 days, possessed a number of silicate secondary phases, including; smectite (iron silicate and potassium iron alumina-silicate, weeksite (uranium silicate), zeolite (calcium potassium alumino-silicate), tobermorite (calcium silicate), and a pure silica phase. However, uranium silicates and smectite have also been observed in tests, which have not undergone the acceleration of reaction, in both the leachate and leached layer, suggesting that these phases are not responsible for the acceleration of reaction.

Buck, E.C.; Fortner, J.A.; Bates, J.K.; Feng, X.; Dietz, N.L.; Bradley, C.R.; Tani, B.S.

1993-12-31T23:59:59.000Z

148

EMSL: Capabilities: Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Microscopy Microscopy Additional Information Meet the Microscopy Experts Related EMSL User Projects Microscopy Tools are Applied to all Science Themes Watch the Microscopy capability video on EMSL's YouTube channel and read the transcript. Microscopy brochure Quiet Wing brochure EMSL hosts a variety of sophisticated microscopy instruments, including electron microscopes, optical microscopes, scanning probe microscopes, and computer-controlled microscopes for automated particle analysis. These tools are used to image a range of sample types with nanoscale-and even atomic-resolution with applications to surface, environmental, biogeochemical, atmospheric, and biological science. Each state-of-the-art instrument and customized capability is equipped with features for specific

149

Using Synchrotron Radiation and Electron Microscopy to Map the Huge Structural Changes that Occur in Viruses During Their Life Cycle  

SciTech Connect (OSTI)

The crystallographic techniques for structure determination of proteins and neucleic acids at near atomic resolution using synchrotron X-radiation has become almost automatic. However the limits of this procedure are determined by the availability of crystals. As the size and complexity of the molecular assemblies being studied increases, the likelihood of growing useful crystals diminishes. Cryo electron microscopy and tomography have extended the range of biological objects that can be determined at near atomic resolution. Furthermore it is now becoming apparent that the function of the molecular assemblies most often requires very large conformational changes that could never be contained within a crystal, Examples will be presented of the structural changes that occur in viruses as they assembly and prepare to infect new cells.

Rossman, Michael (Purdue University) [Purdue University

2011-09-07T23:59:59.000Z

150

A transmission electron microscopy investigation of inverse melting in Nb{sub 45}Cr{sub 55}  

SciTech Connect (OSTI)

In inverse melting, a supersaturated crystalline phase transforms polymorphously under heat treatment to the amorphous state. Inverse melting of body-centered cubic (bcc) Nb{sub 45}Cr{sub 55} is studied using transmission electron microscopy (TEM) and high resolution TEM (HRTEM). The crystalline to amorphous transformation is heterogeneous, initiating at the bcc grain boundaries. HRTEM reveals 2-3 nm domains with medium range order (MRO) in the amorphous phase. Preferred orientation of MRO domains is found on a scale corresponding to the precursor bcc grain size. Using HRTEM and calorimetry, MRO development in cosputtered Nb{sub 45}Cr{sub 55} films is characterized and compared to that in the amorphous phase produced by inverse melting. {copyright} {ital 1997 Materials Research Society.}

Sinkler, W.; Michaelsen, C.; Bormann, R. [Institute for Materials Research, GKSS Research Center, 21502 Geesthacht (Germany)

1997-07-01T23:59:59.000Z

151

Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ion Beam - Scanning Electron Microscopy  

SciTech Connect (OSTI)

X-ray nanotomography and focused ion beam scanning electron microscopy (FIB?SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIBSEM enable elemental mapping within the microstructure. Using these methods, non?destructive 3D x-ray imaging and FIBSEM serial sectioning have been applied to compare three?dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

Nelson, George J.; Harris, William H.; Lombardo, Jeffrey J.; Izzo, Jr., John R.; Chiu, W. K. S.; Tanasini, Pietro; cantoni, Marco; Van herle, Jan; Comninellis, Christos; Andrews, Joy C.; Liu, Yijin; Pianetta, Piero; Chu, Yong

2011-01-01T23:59:59.000Z

152

Transmission electron microscopy characterization of laser-clad iron-based alloy on Al-Si alloy  

SciTech Connect (OSTI)

Microstructure characterization is important for controlling the quality of laser cladding. In the present work, a detailed microstructure characterization by transmission electron microscopy was carried out on the iron-based alloy laser-clad on Al-Si alloy and an unambiguous identification of phases in the coating was accomplished. It was found that there is austenite, Cr{sub 7}C{sub 3} and Cr{sub 23}C{sub 6} in the clad region; {alpha}-Al, NiAl{sub 3}, Fe{sub 2}Al{sub 5} and FeAl{sub 2} in the interface region; and {alpha}-Al and silicon in the heat-affected region. A brief discussion was given for their existence based on both kinetic and thermodynamic principles.

Mei, Z. [State Key Lab of Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074 (China)]. E-mail: mikemei_99@yahoo.com; Wang, W.Y. [Institute of Materials Science and Engineering, Henan University of Science and Technology, Luoyang 471003 (China); Wang, A.H. [State Key Lab of Die and Mould Technology, Huazhong University of Science and Technology, Wuhan 430074 (China)

2006-04-15T23:59:59.000Z

153

Quantification of nanoscale density fluctuations using electron microscopy: Light-localization properties of biological cells  

SciTech Connect (OSTI)

We report a study of the nanoscale mass-density fluctuations of heterogeneous optical dielectric media, including nanomaterials and biological cells, by quantifying their nanoscale light-localization properties. Transmission electron microscope images of the media are used to construct corresponding effective disordered optical lattices. Light-localization properties are studied by the statistical analysis of the inverse participation ratio (IPR) of the localized eigenfunctions of these optical lattices at the nanoscale. We validated IPR analysis using nanomaterials as models of disordered systems fabricated from dielectric nanoparticles. As an example, we then applied such analysis to distinguish between cells with different degrees of aggressive malignancy.

Pradhan, Prabhakar; Damania, Dhwanil; Turzhitsky, Vladimir; Subramanian, Hariharan; Backman, Vadim [Department of Biomedical Engineering, Northwestern University, Evanston, Illinois 60208 (United States); Joshi, Hrushikesh M.; Dravid, Vinayak P. [Department of Material Science and Engineering, Northwestern University, Evanston, Illinois 60208 (United States); Roy, Hemant K. [Department of Internal Medicine, NorthShore University HealthSystem, Evanston, Illinois 60201 (United States); Taflove, Allen [Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, Illinois 60208 (United States)

2010-12-13T23:59:59.000Z

154

Gas mixing system for imaging of nanomaterials under dynamic environments by environmental transmission electron microscopy  

SciTech Connect (OSTI)

A gas mixing manifold system that is capable of delivering a stable pressure stream of a desired composition of gases into an environmental transmission electron microscope has been developed. The system is designed to provide a stable imaging environment upon changes of either the composition of the gas mixture or upon switching from one gas to another. The design of the system is described and the response of the pressure inside the microscope, the sample temperature, and sample drift in response to flow and composition changes of the system are reported.

Akatay, M. Cem [School of Materials Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907 (United States)] [School of Materials Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907 (United States); Zvinevich, Yury; Ribeiro, Fabio H., E-mail: fabio@purdue.edu, E-mail: estach@bnl.gov [Forney Hall of Chemical Engineering, Purdue University, West Lafayette, Indiana 47907 (United States); Baumann, Philipp [Computer Sciences, University of Applied Sciences of Northeastern Switzerland, 4132 Muttenz, Switzerland and Department of Physics, Yeshiva University, New York, New York 10016 (United States)] [Computer Sciences, University of Applied Sciences of Northeastern Switzerland, 4132 Muttenz, Switzerland and Department of Physics, Yeshiva University, New York, New York 10016 (United States); Stach, Eric A., E-mail: fabio@purdue.edu, E-mail: estach@bnl.gov [Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973 (United States)

2014-03-15T23:59:59.000Z

155

Three-Dimensional Aberration-Corrected Scanning Transmission Electron Microscopy for Biology  

SciTech Connect (OSTI)

Recent instrumental developments have enabled greatly improved resolution of scanning transmission electron microscopes (STEM) through aberration correction. An additional and previously unanticipated advantage of aberration correction is the greatly improved depth sensitivity that has led to the reconstruction of a three-dimensional (3D) image from a focal series. In this chapter the potential of aberration-corrected 3D STEM to provide major improvements in the imaging capabilities for biological samples will be discussed. This chapter contains a brief overview ofthe various high-resolution 3D imaging techniques, a historical perspective of the development of STEM, first estimates of the dose-limited axial and lateral resolution on biological samples and initial experiments on stained thin sections.

De Jonge, Niels [ORNL; Sougrat, Rachid [ORNL; Pennycook, Stephen J [ORNL; Peckys, Diana B [ORNL; Lupini, Andrew R [ORNL

2007-01-01T23:59:59.000Z

156

Single-particle cryo-electron microscopy of Rift Valley fever virus  

SciTech Connect (OSTI)

Rift Valley fever virus (RVFV; Bunyaviridae; Phlebovirus) is an emerging human and veterinary pathogen causing acute hepatitis in ruminants and has the potential to cause hemorrhagic fever in humans. We report a three-dimensional reconstruction of RVFV vaccine strain MP-12 (RVFV MP-12) by cryo-electron microcopy using icosahedral symmetry of individual virions. Although the genomic core of RVFV MP-12 is apparently poorly ordered, the glycoproteins on the virus surface are highly symmetric and arranged on a T = 12 icosahedral lattice. Our RVFV MP-12 structure allowed clear identification of inter-capsomer contacts and definition of possible glycoprotein arrangements within capsomers. This structure provides a detailed model for phleboviruses, opens new avenues for high-resolution structural studies of the bunyavirus family, and aids the design of antiviral diagnostics and effective subunit vaccines.

Sherman, Michael B. [Department of Biochemistry and Molecular Biology, University of Texas Medical Branch, Galveston, TX 77555 (United States); Sealy Center for Structural Biology and Molecular Biophysics, University of Texas Medical Branch, Galveston, TX 77555 (United States); Freiberg, Alexander N. [Department of Pathology, University of Texas Medical Branch, Galveston, TX 77555 (United States); Center for Biodefense and Emerging Infectious Diseases, University of Texas Medical Branch, Galveston, TX 77555 (United States); Holbrook, Michael R. [Department of Pathology, University of Texas Medical Branch, Galveston, TX 77555 (United States); Center for Biodefense and Emerging Infectious Diseases, University of Texas Medical Branch, Galveston, TX 77555 (United States); Institute for Human Infections and Immunity, University of Texas Medical Branch, Galveston, TX 77555 (United States); Watowich, Stanley J., E-mail: watowich@xray.utmb.ed [Department of Biochemistry and Molecular Biology, University of Texas Medical Branch, Galveston, TX 77555 (United States); Sealy Center for Structural Biology and Molecular Biophysics, University of Texas Medical Branch, Galveston, TX 77555 (United States); Center for Biodefense and Emerging Infectious Diseases, University of Texas Medical Branch, Galveston, TX 77555 (United States); Institute for Human Infections and Immunity, University of Texas Medical Branch, Galveston, TX 77555 (United States)

2009-04-25T23:59:59.000Z

157

Probing the Degradation Mechanisms in Electrolyte Solutions for Li-ion Batteries by In-Situ Transmission Electron Microscopy  

SciTech Connect (OSTI)

One of the goals in the development of new battery technologies is to find new electrolytes with increased electrochemical stability. In-situ (scanning) transmission electron microscopy ((S)TEM) using an electrochemical fluid cell provides the ability to rapidly and directly characterize electrode/electrolyte interfacial reactions under battery relevant electrochemical conditions. Furthermore, as the electron beam itself causes a localized electrochemical reaction when it interacts with the electrolyte, the breakdown products that occur during the first stages of battery operation can potentially be simulated and characterized using a straightforward in-situ liquid stage (without electrochemical biasing capabilities). In this paper, we have studied the breakdown of a range of inorganic/salt complexes that are used in state-of-the-art Li-ion battery systems. The results of the in-situ (S)TEM experiments matches with previous stability tests performed during battery operation and the breakdown products and mechanisms are also consistent with known mechanisms. This analysis indicates that in-situ liquid stage (S)TEM observations can be used to directly test new electrolyte designs and provide structural insights into the origin of the solid electrolyte interphase (SEI) formation mechanism.

Abellan Baeza, Patricia; Mehdi, Beata L.; Parent, Lucas R.; Gu, Meng; Park, Chiwoo; Xu, Wu; Zhang, Yaohui; Arslan, Ilke; Zhang, Jiguang; Wang, Chong M.; Evans, James E.; Browning, Nigel D.

2014-02-21T23:59:59.000Z

158

Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique  

Science Journals Connector (OSTI)

......prepared by consolidation of amorphous powders in the supercooled liquid region. Intermetallics (2004) 12:1109-1113. 6 Overwijk M H F , Van Den Heuvel F C, Bulle-Lieuwma C W T. Novel scheme for the preparation of transmission electron microscopy specimens......

Pyuck-Pa Choi; Young-Soon Kwon; Ji-Soon Kim; Tala?at Al-Kassab

2007-04-01T23:59:59.000Z

159

Radiation damage of polyethylene single crystals in electron microscopy between 1 and 2.5 MV. II. The influence of temperature  

E-Print Network [OSTI]

1043 Radiation damage of polyethylene single crystals in electron microscopy between 1 and 2.5 MV mécanismes réels décrits par les chimistes. Abstract. 2014 The critical dose measured for polyethylene single. Introduction. Polyethylene single crystals, like every organic sub- stance, lose their crystallinity when

Paris-Sud XI, Université de

160

Profile of Professor of High-Resolution Electron Microscopy for Nanomaterials in the Quantum Nanoscience department (Kavli Institute, faculty of Applied Sciences)  

E-Print Network [OSTI]

Nanoscience department (Kavli Institute, faculty of Applied Sciences) Workload and duration The Quantum Nanoscience department is planning to appoint a permanent full-time professor in the research area of High the High-Resolution Electron Microscopy (HREM) group in the Quantum Nanoscience department at TU Delft

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161

Electron Microscopy Study of Novel Ru Doped La0.8Sr0.2CrO3 as Anode Materials for Solid Oxide Fuel Cells (SOFCs)  

E-Print Network [OSTI]

Electron Microscopy Study of Novel Ru Doped La0.8Sr0.2CrO3 as Anode Materials for Solid Oxide Fuel of Materials Science and Engineering, Northwestern University, 2220 Campus Dr. Evanston, IL 60208 Solid Oxide Fuel Cells (SOFCs) have been the center of research activities with the goal of improving energy

Marks, Laurence D.

162

Development of a user-friendly system for image processing of electron microscopy by integrating a web browser and PIONE with Eos  

Science Journals Connector (OSTI)

......of electron microscopy by integrating a web browser and PIONE with Eos Takafumi Tsukamoto...expert for CUI. Thus we extended Eos to a web system independent of OS with graphical user interfaces (GUI) by integrating web browser. Advantage to use web browser is......

Takafumi Tsukamoto; Takuo Yasunaga

2014-11-01T23:59:59.000Z

163

Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging  

SciTech Connect (OSTI)

Based on the evaluation of lattice parameter maps in aberration corrected high resolution transmission electron microscopy images, we propose a simple method that allows quantifying the composition and disorder of a semiconductor alloy at the unit cell scale with high accuracy. This is realized by considering, next to the out-of-plane, also the in-plane lattice parameter component allowing to separate the chemical composition from the strain field. Considering only the out-of-plane lattice parameter component not only yields large deviations from the true local alloy content but also carries the risk of identifying false ordering phenomena like formations of chains or platelets. Our method is demonstrated on image simulations of relaxed supercells, as well as on experimental images of an In{sub 0.20}Ga{sub 0.80}N quantum well. Principally, our approach is applicable to all epitaxially strained compounds in the form of quantum wells, free standing islands, quantum dots, or wires.

Schulz, T.; Remmele, T.; Korytov, M.; Markurt, T.; Albrecht, M. [Leibniz-Institut fr Kristallzchtung, Max-Born-Strae 2, 12489 Berlin (Germany); Duff, A.; Lymperakis, L.; Neugebauer, J. [Max-Planck-Institut fr Eisenforschung, Max-Planck-Strae 1, 40237 Dsseldorf (Germany); Chze, C. [TopGaN Sp. z o.o., Sokolowska 29/37, 01-142 Warsaw (Poland); Skierbiszewski, C. [TopGaN Sp. z o.o., Sokolowska 29/37, 01-142 Warsaw (Poland); Institute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw (Poland)

2014-01-21T23:59:59.000Z

164

Construction of the Magnetic Phase Diagram of FeMn/Ni/Cu(001) Using Photoemission Electron Microscopy  

SciTech Connect (OSTI)

Single crystalline FeMn/Ni bilayer was epitaxially grown on Cu(001) substrate and investigated by photoemission electron microscopy (PEEM). The FeMn and Ni films were grown into two cross wedges to facilitate an independent control of the FeMn (0-20 ML) and Ni (0-20 ML) film thicknesses. The Ni magnetic phases were determined by Ni domain images as a function of the Ni thickness (d{sub Ni}) and the FeMn thickness (d{sub FeMn}). The result shows that as the Ni thickness increases, the Ni film undergoes a paramagnetic-to-ferromagnetic state transition at a critical thickness of d{sub FM} and an in-plane to out-of-plane spin reorientation transition at a thicker thickness d{sub SRT}. The phase diagram shows that both d{sub FM} and d{sub SRT} increase as the FeMn film establishes its antiferromagnetic order.

Wu, J.; Scholl, A.; Arenholz, E.; Hwang, C.; Qiu, Z. Q.

2011-01-04T23:59:59.000Z

165

Atomic-resolution study of polarity reversal in GaSb grown on Si by scanning transmission electron microscopy  

SciTech Connect (OSTI)

The atomic-resolved reversal of the polarity across an antiphase boundary (APB) was observed in GaSb films grown on Si by high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The investigation of the interface structure at the origin of the APB reveals that coalescence of two domains with Ga-prelayer and Sb-prelayer causes the sublattice reversal. The local strain and lattice rotation distributions of the APB, attributed to the discordant bonding length at the APB with the surrounding GaSb lattice, were further studied using the geometric phase analysis technique. The crystallographic characteristics of the APBs and their interaction with other planar defects were observed with HAADF-STEM. The quantitative agreement between experimental and simulated images confirms the observed polarities in the acquired HAADF-STEM data. The self-annihilation mechanism of the APBs is addressed based on the rotation induced by anti-site bonds and APBs' faceting.

Hosseini Vajargah, S.; Woo, S. Y.; Botton, G. A. [Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Ghanad-Tavakoli, S. [Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Kleiman, R. N.; Preston, J. S. [Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Department of Engineering Physics, McMaster University, Hamilton, Ontario L8S 4L7 (Canada)

2012-11-01T23:59:59.000Z

166

Investigation of metal dusting mechanism in Fe-base alloys using Raman spectroscopy, x-ray diffraction, and electron microscopy.  

SciTech Connect (OSTI)

The metal-dusting phenomenon, which is a metal loss process that occurs in hot reactive gases, was investigated in iron and certain iron-base alloys by Raman scattering, X-ray diffraction (XRD), and scanning-electron microscopy (SEM). Coke from metal dusting exhibits six Raman bands at 1330(D band), 1580(G band), 1617, 2685, 3920, and 3235 cm-1. The bandwidths and the relative intensities of the 1330 and 1580 cm-1 bands are related to the crystallinity and defect structure of the coke. Both Raman and XRD analyses suggest that the metal-dusting process influences the catalytic crystallization of carbon. A new mechanism of metal dusting is, therefore, proposed, based on the premise that coke cannot crystallize well by deposition from carburizing gases at low temperature without catalytic activation because of its strong C-C bonds and high melting temperature. Cementite or iron participates in the coke-crystallizing process in a manner that tends to improve the crystallinity of the coke. At the same time, fine iron or cementite particles are liberated from the pure metal or alloys.

Zeng, Z.; Natesan, K.; Maroni, V. A.

2002-08-01T23:59:59.000Z

167

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Publications Publications The publications listed below are based on work carried out in the EMC. Publication time period: October 1, 2009, through September 30, 2010 Published journal articles (refereed): C. An, S. Peng, Y. Sun, “Facile Synthesis of Sunlight-Driven Plasmonic AgCl:Ag Nanophotocatalysts," Adv. Mater. 22, 2570 (2010). S. Avci, Z. L. Xiao, J. Hua, A. Imre, R. Divan, J. Pearson, U. Welp, W. K. Kwok, and G. W. Crabtree, “Matching effect and dynamic phases of vortex matter in Bi2Sr2CaCu2O8 nanoribbon with a periodic array of holes,” Appl. Phys. Lett. 97, 042511 (2010). A. Belkin, V. Novosad, M. Iavarone, R. Divan, J. Hiller, T. Prolier, J. E. Pearson, and G. Karapetrov “Giant conductance anisotropy in magnetically coupled F/S/F structures,” Appl. Phys. Lett. 96, 092513 (2010)

168

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Proposal Access Guidelines Proposal Access Guidelines One part of the EMC mission is to provide unique instrumentation and expertise to the scientific community. Important to achieving this goal is the effective management of EMC instrumentation and staff for maximum scientific impact. Broad and fair access to these resources is achieved through a proposal review process and scheduling and access policies. The type of access granted is based on the nature of the proposed work, the qualifications of the user, and the instrumentation requested. Research projects may be allocated a specific amount of instrument time or may be granted continuous access. Allocated Access: Under allocated access, a user is allocated a specific amount of instrument time to complete the proposed project. Allocated access is utilized primarily to manage instrument time for those instruments that have very high demand and for projects that require exceptional staff assistance.

169

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Resources for EMC staff members Resources for EMC staff members Gain access to proposals and other records in the EMC proposal database There are two methods, and both require a username and password. You will have access to the following layouts: AEM Proposals for Tech Review, IVEM Proposals for Tech Review, Users' Data, and Technical Reviews. You will not be able to view Personally Identifiable Information (PII). Do not let EMC users access these layouts! Users are limited to submitting proposals via the guest login or editing their proposals via a temporary login given to them by the database administrator. The best method is to use FileMaker Pro. From the File menu, choose Open Remote, then the Host jude.cnm.anl.gov, and then the emc_proposal database. The second method is to use a web browser. The URL for the proposal database is https://pico.cnm.anl.gov/proposals. Login with your web username and password that you have received from the database administrator; these can be different from your FileMaker network login.

170

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

FEI Quanta 400F ESEM FEI Quanta 400F ESEM Instrument capabilities: Instrument specifications: Accelerating voltages: 2-30 kV Schottky FEG emitter SEI resolution (actual) at 30 kV: 3 nm at 1330 Pa; 10 nm at 2660 Pa Operating modes: SEI; BEI; specimen chamber pressures from high vacuum to 2660 Pa; various specimen chamber gases (air & water vapor standard; Ar, N2 and He also tested; other gases may be possible); XEDS (Be window – no elements below Na); telepresence. Specimen stage: 5-axis motorized Maximum sample size: 100 x 100 mm (XY) Heating (1770 K) Peltier-cooled (248 K to 328 K) Typical experiments (examples): Imaging of insulating/dielectric materials Imaging biomaterials and polymers at high water vapor pressures In situ materials processing XEDS mapping and spectrum imaging

171

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

(Purdue U.); X.-M. Lin (Argonne-CNM) Functionalized Aligned Carbon Nanotubes as Electrocatalyst for Fuel Cell Applications J. Yang (Argonne-CSE) Growth of Anisotropic Silver...

172

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Resources Resources The EMC currently operates and administers seven full-time user instruments together with support facilities that include specimen preparation, image analysis and computational resources. The instruments are grouped below according to their function and capabilities. Detailed information about the capabilities of each user-accessible resource is available via the underlined links below. The major-capability instruments are generally available by allocated access while the core instruments are generally available by continuous access. Instrument Access Type User Status Separate Proposal? ACAT Allocated Assisted yes IVEM Allocated Assisted yes FEI Tecnai F20ST TEM/STEM Continuous or Allocated User or Assisted Any or all of these instruments may be requested in one proposal.

173

Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis  

Science Journals Connector (OSTI)

......microscopy, failure analysis, nanometer-scale, pinpoint analysis...device performance, reliability and manufacturing...part of failure analysis. In view of the...vapour deposition reactor. The source/drain......

Satoshi Tsuji; Katsuhiro Tsujimoto; Kotaro Kuroda; Hiroyasu Saka

2004-10-01T23:59:59.000Z

174

Particularities of high-voltage electron microscopy: instrument design, defect imaging and in situ investigation in 'thick' specimens  

Science Journals Connector (OSTI)

......microscopy: instrument design, defect imaging and in situ investigation in 'thick' specimens Roger Valle1 and Alain Marraud2 'DMSC, ONERA, 29 Av. de la Division Leclerc, F-92322 Chatillon Cedex and 2 LMSSM, ECP, Grande Voie des Vignes, F-92295 Chatenay-Malabry......

Roger Valle; Alain Marraud

1999-01-01T23:59:59.000Z

175

Topography, complex refractive index, and conductivity of graphene layers measured by correlation of optical interference contrast, atomic force, and back scattered electron microscopy  

SciTech Connect (OSTI)

The optical phase shift by reflection on graphene is measured by interference contrast microscopy. The height profile across graphene layers on 300?nm thick SiO{sub 2} on silicon is derived from the phase profile. The complex refractive index and conductivity of graphene layers on silicon with 2?nm thin SiO{sub 2} are evaluated from a phase profile, while the height profile of the layers is measured by atomic force microscopy. It is observed that the conductivity measured on thin SiO{sub 2} is significantly greater than on thick SiO{sub 2}. Back scattered electron contrast of graphene layers is correlated to the height of graphene layers.

Vaupel, Matthias, E-mail: Matthias.vaupel@zeiss.com; Dutschke, Anke [Training Application Support Center, Carl Zeiss Microscopy GmbH, Knigsallee 9-21, 37081 Gttingen (Germany); Wurstbauer, Ulrich; Pasupathy, Abhay [Department of Physics, Columbia University New York, 538 West 120th Street, New York, New York 10027 (United States); Hitzel, Frank [DME Nanotechnologie GmbH, Geysostr. 13, D-38106 Braunschweig (Germany)

2013-11-14T23:59:59.000Z

176

Microscopy. II. Electron Microscopy: A Review  

Science Journals Connector (OSTI)

...important role in regulation of energy metabolism and will be the subject...a P 0.001) are marked in dark gray. Light gray boxes indicate...translation factor eIF4E: a survey of its expression in breast...revealed marked up-regulation of energy, protein translation, and...

Cecily Cannan Selby

1953-11-01T23:59:59.000Z

177

Electron-microscopy study of the triple-q to single-q phase transition in the incommensurate phase of quartz under stress  

Science Journals Connector (OSTI)

The triple-q to single-q phase transition in quartz has been studied by electron microscopy using a heating straining device, stress being applied along the x axis. The interpretation of the experimental images obtained for small values of stress is in agreement with theoretical predictions. The presence of an intermediate state between the triple-q and single-q modulated phases has been observed for higher values of stress. It can be described as a double-q state where the two wave vectors are tilted from the y direction by an angle of +cphi and -cphi that decreases to 0 in the single-q stripe phase.

E. Snoeck and C. Roucau

1992-06-01T23:59:59.000Z

178

Direct observation of the intergrown {alpha}-phase in {beta}-TmAlB{sub 4} via high-resolution electron microscopy  

SciTech Connect (OSTI)

A TmAlB{sub 4} crystal with a ThMoB{sub 4}-type ({beta}-type) structure phase related to a hexagonal AlB{sub 2}-type structure was studied by electron diffraction and high-resolution electron microscopy. A high-resolution image clearly exhibits an intergrown lamellar structure of a YCrB{sub 4}-type ({alpha}-type) phase in the matrix of the {beta}-type phase in TmAlB{sub 4} crystal. The lamellar structure can be characterized by a tiling of deformed hexagons, which are a common structure unit in the {alpha}-type and {beta}-type structures. The intergrown nanostructure is considered to be attributed to the origin of low temperature anomalies in physical properties.

Yubuta, Kunio, E-mail: yubuta@imr.tohoku.ac.jp [Institute for Materials Research, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577 (Japan); Mori, Takao [International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba 305-0044 (Japan); Leithe-Jasper, Andreas; Grin, Yuri [Max-Plank-Institut fuer Chemische Physik fester Stoeffe, 01187 Dresden (Germany); Okada, Shigeru [Department of Science and Engineering, Kokushikan University, Tokyo 154-8515 (Japan); Shishido, Toetsu [Institute for Materials Research, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577 (Japan)

2009-08-05T23:59:59.000Z

179

Temperature-induced martensite in magnetic shape memory Fe{sub 2}MnGa observed by photoemission electron microscopy  

SciTech Connect (OSTI)

The magnetic domain structure in single crystals of a Heusler shape memory compound near the composition Fe{sub 2}MnGa was observed during phase transition by photoelectron emission microscopy at Beamline 11.0.1.1 of the Advanced Light Source. The behavior is comparable with recent observations of an adaptive martensite phase in prototype Ni{sub 2}MnGa, although the pinning in the recent work is an epitaxial interface and in this work the e#11;ective pinning plane is a boundary between martensitic variants that transform in a self-accommodating way from the single crystal austenite phase present at high temperatures. Temperature dependent observations of the twinning structure give information as to the coupling behavior between the magnetism and the structural evolution.

Jenkins, Catherine; Scholl, Andreas; Kainuma, R.; Elmers, Hans-Joachim; Omori, Toshihiro

2012-01-18T23:59:59.000Z

180

Transmission electron microscopy study of the effect of selenium doping on the ordering of GalnP2  

Science Journals Connector (OSTI)

Selenium doped Ga0.51In0.49P films have been grown by metalorganic chemical vapour deposition at 600, 670 and 740 C. The extent of ordering of the Group III sublattice has been monitored by transmission electron...

J. P. Goral; Sarah R. Kurtz; J. M. Olson; A. Kibbler

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


181

Transmission electron microscopy assisted in-situ joule heat dissipation study of individual InAs nanowires  

SciTech Connect (OSTI)

Managing heat transport at nanoscale is an important and challenging task for nanodevice applications and nanostructure engineering. Herein, through in-situ engineering nanowire (NW)-electrode contacts with electron beam induced carbon deposition in a transmission electron microscope, Joule heat dissipation along individual suspended Indium Arsenide NWs is well managed to obtain pre-designed temperature profiles along NWs. The temperature profiles are experimentally determined by the breakdown site of NWs under Joule heating and breakdown temperature measurement. A model with NW-electrode contacts being well considered is proposed to describe heat transport along a NW. By fitting temperature profiles with the model, thermal conductance at NW-electrode contacts is obtained. It is found that, the temperature profile along a specific NW is mainly governed by the relative thermal conductance at the two NW-electrode contacts, which is engineered in experiments.

Xu, T. T.; Wei, X. L., E-mail: weixl@pku.edu.cn, E-mail: qingchen@pku.edu.cn; Shu, J. P.; Chen, Q., E-mail: weixl@pku.edu.cn, E-mail: qingchen@pku.edu.cn [Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871 (China)

2013-11-04T23:59:59.000Z

182

Spectroscopic ellipsometric modeling of a BiTeSe write layer of an optical data storage device as guided by atomic force microscopy, scanning electron microscopy, and X-ray diffraction  

Science Journals Connector (OSTI)

Abstract Conventional magnetic tape is the most widely used medium for archival data storage. However, data stored on it need to be migrated every ca. 5years. Recently, optical discs that store information for hundreds, or even more than 1000years, have been introduced to the market. We recently proposed that technology in these optical discs be used to make an optical tape that would show greater permanence than its magnetic counterpart. Here we provide a detailed optical characterization of a sputtered thin film of bismuth, tellurium, and selenium (BTS) that is a proposed data storage layer for these devices. The methodology described herein should be useful in the future development of related materials. Spectroscopic ellipsometry (SE) data are obtained using interference enhancement, and the modeling of this data is guided by results from atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), and X-ray reflectivity (XRR). By AFM, ca. 40nm BTS films show ca. 10nm roughness. SEM images also suggest considerable roughness in the films and indicate that they are composed of 13.15.9nm grains. XRD confirms that the films are crystalline and predicts a grain size of 172nm. XRD results are consistent with the composition of the films a mildly oxidized BTS material. Three models of increasing complexity are investigated to explain the SE data. The first model consists of a smooth, homogeneous BTS film. The second model adds a roughness layer to the previous model. The third model also has two layers. The bottom layer is modeled as a mixture of BTS and void using a Bruggeman effective medium approximation. The upper layer is similarly modeled, but with a gradient. The first model was unable to adequately model the SE data. The second model was an improvement lower MSE (4.4) and good agreement with step height measurements. The third model was even better very low MSE (2.6) and good agreement with AFM results. The third SE model predicted ca. 90% void at the film surface. XRR modeling of the film agreed well with the predictions from SE. The uniquenesses of the SE models were confirmed.

Hao Wang; Nitesh Madaan; Jacob Bagley; Anubhav Diwan; Yiqun Liu; Robert C. Davis; Barry M. Lunt; Stacey J. Smith; Matthew R. Linford

2014-01-01T23:59:59.000Z

183

Study of hard disk and slider surfaces using X-ray photoemission electron microscopy and near-edge X-ray absorption fine structure spectroscopy  

SciTech Connect (OSTI)

X-ray Photo Emission Electron Microscopy (X-PEEM) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy were applied to study the properties of amorphous hard carbon overcoats on disks and sliders, and the properties of the lubricant. The modification of lubricants after performing thermal desorption studies was measured by NEXAFS, and the results are compared to the thermal desorption data. The study of lubricant degradation in wear tracks is described. Sliders were investigated before and after wear test, and the modification of the slider coating as well as the transfer of lubricant to the slider was studied. The studies show that the lubricant is altered chemically during the wear. Fluorine is removed and carboxyl groups are formed.

Anders, S.; Stammler, T. [Lawrence Berkeley National lab., CA (United States). Advanced Light Source Div.; Bhatia, C.S. [SSD/IBM, San Jose, CA (United States); Stoehr, J. [IBM Research Div., San Jose, CA (United States). Almaden Research Center; Fong, W.; Chen, C.Y.; Bogy, D.B. [Univ. of California, Berkeley, CA (United States)

1998-04-01T23:59:59.000Z

184

A transmission electron microscopy study of the deformation behavior underneath nanoindents in nano-scale Al-TiN multilayered composites  

SciTech Connect (OSTI)

Nano-scale multilayered Al-TiN composites were deposited with DC magnetron sputtering technique in two different layer thickness ratios - Al:TiN = 1:1 and Al:TiN = 9:1. The Al layer thickness varied from 2 nm to 450 nm. The hardness of the samples was tested by nanoindentation using a Berkovich tip. Cross-sectional Transmission Electron Microscopy (TEM) was carried out on samples extracted with Focused Ion Beam (FIB) from below the nanoindents. This paper presents the results of the hardness tests in the Al-TiN multilayers with the two different thickness ratios and the observations from the cross-sectional TEM studies of the regions underneath the indents. These studies showed remarkable strength in the multilayers, as well as some very interesting deformation behavior in the TiN layers at extremely small length scales, where the hard TiN layers undergo co-deformation with the Al layers.

Bhattacharyya, Dhriti [Los Alamos National Laboratory; Mara, Nathan A [Los Alamos National Laboratory; Dickerson, Patricia O [Los Alamos National Laboratory; Misra, Amit [Los Alamos National Laboratory; Hoagland, R G [Los Alamos National Laboratory

2009-01-01T23:59:59.000Z

185

Single-walled carbon nanotubes and nanocrystalline graphene reduce beam-induced movements in high-resolution electron cryo-microscopy of ice-embedded biological samples  

E-Print Network [OSTI]

For single particle electron cryo-microscopy (cryoEM), contrast loss due to beam-induced charging and specimen movement is a serious problem, as the thin films of vitreous ice spanning the holes of a holey carbon film are particularly susceptible to beam-induced movement. We demonstrate that the problem is at least partially solved by carbon nanotechnology. Doping ice-embedded samples with single-walled carbon nanotubes (SWNT) in aqueous suspension or adding nanocrystalline graphene supports, obtained by thermal conversion of cross-linked self-assembled biphenyl precursors, significantly reduces contrast loss in high-resolution cryoEM due to the excellent electrical and mechanical properties of SWNTs and graphene.

Daniel Rhinow; Nils-Eike Weber; Andrey Turchanin; Armin Glzhuser; Werner Khlbrandt

2011-10-06T23:59:59.000Z

186

Electronic structures and bonding properties of chlorine-treated nitrogenated carbon nanotubes: X-ray absorption and scanning photoelectron microscopy studies  

SciTech Connect (OSTI)

The electronic and bonding properties of nitrogenated carbon nanotubes (N-CNTs) exposed to chlorine plasma were investigated using C and N K-edge x-ray absorption near-edge structure (XANES) and scanning photoelectron microscopy (SPEM). The C and N K-edge XANES spectra of chlorine-treated N-CNTs consistently reveal the formation of pyridinelike N-CNTs by the observation of 1s{yields}{pi}*(e{sub 2u}) antibonding and 1s{yields}{pi}*(b{sub 2g}) bonding states. The valence-band photoemission spectra obtained from SPEM images indicate that chlorination of the nanotubes enhances the C-N bonding. First-principles calculations of the partial densities of states in conjunction with C K-edge XANES data identify the presence of C-Cl bonding in chlorine treated N-CNTs.

Ray, S. C.; Pao, C. W.; Tsai, H. M.; Chiou, J. W.; Pong, W. F.; Chen, C. W.; Tsai, M.-H.; Papakonstantinou, P.; Chen, L. C.; Chen, K. H.; Graham, W. G. [Department of Physics, Tamkang University, Tamsui 251, Taiwan (China); Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Department of Physics, National Sun Yat-Sen University, Kaohsiung 804, Taiwan (China); NRI, School of Electrical and Mechanical Engineering, University of Ulster at Jordanstown, Newtownabbey, County Antrim BT37OQB, Northern Ireland (United Kingdom); Center for Condensed Matter Sciences, National Taiwan University, Taipei 106, Taiwan (China); Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan (China); Department of Physics and Astronomy, Queens University of Belfast, Belfast, Antrim BT71NN, Northern Ireland (United Kingdom)

2007-05-07T23:59:59.000Z

187

In situ transmission electron microscopy investigation of the interfacial reaction between Ni and Al during rapid heating in a nanocalorimeter  

SciTech Connect (OSTI)

The Al/Ni formation reaction is highly exothermic and of both scientific and technological significance. In this report, we study the evolution of intermetallic phases in this reaction at a heating rate of 830 K/s. 100-nm-thick Al/Ni bilayers were deposited onto nanocalorimeter sensors that enable the measurement of temperature and heat flow during rapid heating. Time-resolved transmission electron diffraction patterns captured simultaneously with thermal measurements allow us to identify the intermetallic phases present and reconstruct the phase transformation sequence as a function of time and temperature. The results show a mostly unaltered phase transformation sequence compared to lower heating rates.

Grapes, Michael D., E-mail: mgrapes1@jhu.edu, E-mail: david.lavan@nist.gov, E-mail: weihs@jhu.edu [Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States); Material Measurement Laboratory, Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); LaGrange, Thomas; Reed, Bryan W.; Campbell, Geoffrey H. [Lawrence Livermore National Laboratory, Materials Science and Technology Division, Livermore, California 94550 (United States); Woll, Karsten [Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States); Institute of Applied Materials, Karlsruhe Institute of Technology, 76344 Eggenstein-Leopoldshafen (Germany); LaVan, David A., E-mail: mgrapes1@jhu.edu, E-mail: david.lavan@nist.gov, E-mail: weihs@jhu.edu [Material Measurement Laboratory, Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Weihs, Timothy P., E-mail: mgrapes1@jhu.edu, E-mail: david.lavan@nist.gov, E-mail: weihs@jhu.edu [Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States)

2014-11-01T23:59:59.000Z

188

Structural defects in epitaxial graphene layers synthesized on C-terminated 4H-SiC (0001{sup }) surfaceTransmission electron microscopy and density functional theory studies  

SciTech Connect (OSTI)

The principal structural defects in graphene multilayers synthesized on the carbon-terminated face of a 4H-SiC (0001{sup }) substrate were investigated using the high-resolution transmission electron microscopy. The analyzed systems include a wide variety of defected structures such as edge dislocations, rotational multilayers, and grain boundaries. It was shown that graphene layers are composed of grains of the size of several nanometres or larger; they differ in a relative rotation by large angles, close to 30. The structure of graphene multilayers results from the synthesis on a SiC (0001{sup }) surface, which proceeds via intensive nucleation of new graphene layers that coalesce under various angles creating an immense orientational disorder. Structural defects are associated with a built-in strain resulting from a lattice mismatch between the SiC substrate and the graphene layers. The density functional theory data show that the high-angular disorder of AB stacked bi-layers is not restoring the hexagonal symmetry of the lattice.

Borysiuk, J., E-mail: jolanta.borysiuk@ifpan.edu.pl [Institute of Physics, Polish Academy of Sciences, Al. Lotnikw 32/46, 02-668 Warsaw (Poland); Faculty of Physics, University of Warsaw, Ho?a 69, 00-681 Warsaw (Poland); So?tys, J.; Piechota, J. [Interdisciplinary Centre for Mathematical and Computational Modelling, University of Warsaw, Pawi?skiego 5a, 02-106 Warsaw (Poland); Krukowski, S. [Interdisciplinary Centre for Mathematical and Computational Modelling, University of Warsaw, Pawi?skiego 5a, 02-106 Warsaw (Poland); Institute of High Pressure Physics, Polish Academy of Sciences, Soko?owska 29/37, 01-142 Warsaw (Poland); Baranowski, J. M. [Faculty of Physics, University of Warsaw, Ho?a 69, 00-681 Warsaw (Poland); Institute of Electronic Materials Technology, Wlczy?ska 133, 01-919 Warsaw (Poland); St?pniewski, R. [Faculty of Physics, University of Warsaw, Ho?a 69, 00-681 Warsaw (Poland)

2014-02-07T23:59:59.000Z

189

Influence of Surface Preparation on Scanning Kelvin Probe Microscopy and Electron Backscatter Diffraction Analysis of Cross Sections of CdTe/CdS Solar Cells  

SciTech Connect (OSTI)

Electron backscatter diffraction (EBSD) provides information on the crystallographic structure of a sample, while scanning Kelvin probe microscopy (SKPM) provides information on its electrical properties. The advantage of these techniques is their high spatial resolution, which cannot be attained with any other techniques. However, because these techniques analyze the top layers of the sample, surface or cross section features directly influence the results of the measurements, and sample preparation is a main step in the analysis. In this work we investigated different methods to prepare cross sections of CdTe/CdS solar cells for EBSD and SKPM analyses. We observed that procedures used to prepare surfaces for EBSD are not suitable to prepare cross sections, and we were able to develop a process using polishing and ion-beam milling. This process resulted in very good results and allowed us to reveal important aspects of the cross section of the CdTe films. For SKPM, polishing and a light ion-beam milling resulted in cross sections that provided good data. We were able to observe the depletion region on the CdTe film and the p-n junction as well as the interdiffusion layer between CdTe and CdS. However, preparing good-quality cross sections for SKPM is not a reproducible process, and artifacts are often observed.

Moutinho, H. R.; Dhere, R. G.; Jiang, C. S.; Al-Jassim, M. M.

2011-01-01T23:59:59.000Z

190

Direct comparison between X-ray nanotomography and scanning electron microscopy for the microstructure characterization of a solid oxide fuel cell anode  

SciTech Connect (OSTI)

X-ray computed nanotomography (nano-CT) and scanning electron microscopy (SEM) have been applied to characterize the microstructure of a Solid Oxide Fuel Cell (SOFC) anode. A direct comparison between the results of both methods is conducted on the same region of the microstructure to assess the spatial resolution of the nano-CT microstructure, SEM being taken as a reference. A registration procedure is proposed to find out the position of the SEM image within the nano-CT volume. It involves a second SEM observation, which is taken along an orthogonal direction and gives an estimate reference SEM image position, which is then refined by an automated optimization procedure. This enables an unbiased comparison between the cell porosity morphologies provided by both methods. In the present experiment, nano-CT is shown to underestimate the number of pores smaller than 1 ?m and overestimate the size of the pores larger than 1.5 ?m. - Highlights: ? X-ray computed nanotomography (nano-CT) and SEM are used to characterize an SOFC anode. ? A methodology is proposed to compare the nano-CT and SEM data on the same region. ? The spatial resolution of the nano-CT data is assessed from that comparison.

Quey, R., E-mail: quey@emse.fr [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); cole des Mines de Saint-tienne, CNRS UMR 5307, 158 cours Fauriel, 42023 Saint-tienne, Cedex 2 (France); Suhonen, H., E-mail: heikki.suhonen@esrf.fr [European Synchrotron Radiation Facility (ESRF), 6 Rue Jules Horowitz BP 220, 38043 Grenoble (France); Laurencin, J., E-mail: jerome.laurencin@cea.fr [CEA-Liten, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Cloetens, P., E-mail: peter.cloetens@esrf.fr [European Synchrotron Radiation Facility (ESRF), 6 Rue Jules Horowitz BP 220, 38043 Grenoble (France); Bleuet, P., E-mail: pierre.bleuet@cea.fr [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France)

2013-04-15T23:59:59.000Z

191

Elemental relationships in rock varnish as seen with SEM/EDX (scanning electron microscopy/energy dispersive x-ray) elemental line profiling  

SciTech Connect (OSTI)

The heterogeneous nature of rock varnish requires a thorough survey of elemental and mineralogic compositions before relating chemical variability of rock varnish to past geochemical environments. Elemental relationships in rock varnish can be examined using scanning electron microscopy (SEM) in conjunction with an elemental line profiling routine using semi-quantitative, energy dispersive x-ray (EDX) analysis. Results of SEM/EDX analysis suggest: variations in cation concentrations used in varnish cation ratio dating relate more specifically to variations in detritus within the varnish than to element mobility as defined by weathering indices; Mn concentration rather than Mn:Fe ratios may be a more appropriate indicator of paleoclimatic fluctuations; and the Mn-oxide phase existing in varnish is most likely a Ba-enriched phase rather than birnessite. Element line profiling offers great potential for gaining insights into geochemical processes affecting the deposition and diagenesis of rock varnish and for testing hypotheses relating to its chemical variability. 27 refs., 9 figs.

Raymond, R. Jr.; Reneau, S.L.; Harrington, C.D.

1990-01-01T23:59:59.000Z

192

UHV high-resolution electron microscopy and chemical analysis of room-temperature Au deposition on Si(001)-21  

Science Journals Connector (OSTI)

Investigations of Au on Si(001) have suggested that room-temperature deposition of Au on a clean Si surface results in an interfacial reaction and the formation of a gold-silicide. However, these investigations typically lack direct information about the surface morphology or the exact structure at the interface. Utilizing the capabilities of a surface chemical analysis system attached to a Hitachi UHV H-9000 microscope, a layer plus island growth mode has been observed by high-resolution electron microscopy showing multiply twinned small particles on the surface. The presence of small particles for various coverages has been correlated with the shifts seen in the Si 2p and Au 4f binding energies as well as the peak splitting in the Si LVV Auger transition. Our chemical data are consistent with observed shifts in the binding energies of small metal clusters deposited on various substrates, and with the published data for this surface. In addition, the results are consistent with our previous studies of Ag on Si(001), and indicate the growth morphology plays a crucial role in understanding spectroscopic information as well as its correlation to the structure and chemical state of the interface and surface morphology.

E. Landree, D. Grozea, C. Collazo-Davila, and L. D. Marks

1997-03-15T23:59:59.000Z

193

Understanding Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic Resolution Electron Microscopy and Field Evaporation Simulation  

SciTech Connect (OSTI)

Metal-dielectric composite materials, specifically metal nanoparticles supported on or embedded in metal oxides, are widely used in catalysis. The accurate optimization of such nanostructures warrants the need for detailed three-dimensional characterization. Atom probe tomography is uniquely capable of generating sub-nanometer structural and compositional data with part-per-million mass sensitivity, but there are reconstruction artifacts for composites containing materials with strongly differing fields of evaporation, as for oxide-supported metal nanoparticles. By correlating atom probe tomography with scanning transmission electron microscopy for Au nanoparticles embedded in an MgO support, deviations from an ideal topography during evaporation are demonstrated directly, and correlated with compositional errors in the reconstructed data. Finite element simulations of the field evaporation process confirm that protruding Au nanoparticles will evolve on the tip surface, and that evaporation field variations lead to an inaccurate assessment of the local composition, effectively lowering the spatial resolution of the final reconstructed dataset. Cross-correlating the experimental data with simulations results in a more detailed understanding of local evaporation aberrations during APT analysis of metal-oxide composites, paving the way towards a more accurate three-dimensional characterization of this technologically important class of materials.

Devaraj, Arun; Colby, Robert J.; Vurpillot, F.; Thevuthasan, Suntharampillai

2014-03-26T23:59:59.000Z

194

Quantification of Artifacts in Scanning Electron Microscopy Tomography: Improving the Reliability of Calculated Transport Parameters in Energy Applications such as Fuel Cell and Battery Electrodes  

Science Journals Connector (OSTI)

Abstract Focused ion beam and scanning electron microscopy tomography (FIB-SEMt) is commonly used to extract reactant transport relevant parameters from nano-porous materials in energy applications, such as fuel cells or batteries. Here we present an approach to virtually model the errors in FIB-SEMt which are caused by the FIB cutting distance. The errors are evaluated in terms of connectivity, solid volume fraction (SVF), conductivity, diffusivity, as well as mean grain and pore sizes. For state-of-the-art FIB-SEMt experiments, where a hydrogen fuel cell catalyst layer with 60 nm mean grain size and 40 % SVF is sectioned with a cutting distance of 15 nm, the error in our simulation ranges up to 51 % (conductivity), whereas other parameters remain largely unaffected (Laplace diffusivity, 4 %). We further present a method, employing virtual coarsening and back interpolation, to reduce FIB cutting distance errors in all investigated parameters. Both error evaluation and correction are applicable to sphere based porous materials with relevance for the energy conversion and storage sector such as polymer electrolyte membrane fuel cell catalyst layer (PEMFC CL), battery carbon binder domain (CBD) or supercapacitor electrodes.

Matthias Klingele; Roland Zengerle; Simon Thiele

2014-01-01T23:59:59.000Z

195

The structures and dynamics of atomic and molecular adsorbates on metal surfaces by scanning tunneling microscopy and low energy electron diffraction  

SciTech Connect (OSTI)

Studies of surface structure and dynamics of atoms and molecules on metal surfaces are presented. My research has focused on understanding the nature of adsorbate-adsorbate and adsorbate-substrate interactions through surface studies of coverage dependency and coadsorption using both scanning tunneling microscopy (STM) and low energy electron diffraction (LEED). The effect of adsorbate coverage on the surface structures of sulfur on Pt(111) and Rh(111) was examined. On Pt(111), sulfur forms p(2x2) at 0.25 ML of sulfur, which transforms into a more compressed ({radical}3x{radical}3)R30{degrees} at 0.33 ML. On both structures, it was found that sulfur adsorbs only in fcc sites. When the coverage of sulfur exceeds 0.33 ML, it formed more complex c({radical}3x7)rect structure with 3 sulfur atoms per unit cell. In this structure, two different adsorption sites for sulfur atoms were observed - two on fcc sites and one on hcp site within the unit cell.

Yoon, Hyungsuk Alexander

1996-12-01T23:59:59.000Z

196

Direct electron detection in transmission electron microscopy  

E-Print Network [OSTI]

Duttweiler, J. Bouwer, S. Peltier, M. Ellisman, P. Denes, F.J. C. Bouwer, S. T. Peltier, M. Ellisman and N. -H. Xuong (J. C. Bouwer, S. T. Peltier, M. H. Ellisman and N. H.

Jin, Liang

2009-01-01T23:59:59.000Z

197

Direct electron detection in transmission electron microscopy  

E-Print Network [OSTI]

a three-stage thermoelectric cooling module was coupled withbetween the thermoelectric cooling module and the backside

Jin, Liang

2009-01-01T23:59:59.000Z

198

Optical Microscopy and 4Optical Microscopy and 4 Pi MicroscopyPi Microscopy  

E-Print Network [OSTI]

Optical Microscopy and 4Optical Microscopy and 4 Pi MicroscopyPi Microscopy Carolyn A. SuttonCarolyn A. Sutton PH 464PH 464 #12;OverviewOverview The OpticalThe Optical MicroscopeMicroscopy 4 Pi Microscopy4 Pi Microscopy Optical Microscope for Metallography #12;Optical Microscope: OriginsOptical

La Rosa, Andres H.

199

Geochemistry Atomic Force Microscopy | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

imaging modes: contact, intermittent contact, phase imaging, magnetic force microscopy, electric force microscopy, surface potential microscopy, scanning capacitance microscopy,...

200

Diamondoids Improve Electron Emitters  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

is unique to diamondoid, is believed to enable the development of a new generation of electron emitters with unprecedented properties. In Photoemission Electron Microscopy...

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


201

Biological Imaging by Soft X-Ray Diffraction Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray...

202

Scanning Probe Microscopy Studies of Carbon Nanotubes  

E-Print Network [OSTI]

Scanning Probe Microscopy Studies of Carbon Nanotubes Teri Wang Odom1 , Jason H. Hafner1 relationship between Single-Walled Carbon Nanotube (SWNT) atomic structure and electronic properties, (2, properties and application of carbon nanotube probe microscopy tips to ultrahigh resolution and chemically

Odom, Teri W.

203

Electrostatically focused addressable field emission array chips (AFEA's) for high-speed massively parallel maskless digital E-beam direct write lithography and scanning electron microscopy  

DOE Patents [OSTI]

Systems and methods are described for addressable field emission array (AFEA) chips. A method of operating an addressable field-emission array, includes: generating a plurality of electron beams from a pluralitly of emitters that compose the addressable field-emission array; and focusing at least one of the plurality of electron beams with an on-chip electrostatic focusing stack. The systems and methods provide advantages including the avoidance of space-charge blow-up.

Thomas, Clarence E. (Knoxville, TN); Baylor, Larry R. (Farragut, TN); Voelkl, Edgar (Oak Ridge, TN); Simpson, Michael L. (Knoxville, TN); Paulus, Michael J. (Knoxville, TN); Lowndes, Douglas H. (Knoxville, TN); Whealton, John H. (Oak Ridge, TN); Whitson, John C. (Clinton, TN); Wilgen, John B. (Oak Ridge, TN)

2002-12-24T23:59:59.000Z

204

Coherence of Electron Wave and Contrast of Electron Image  

Science Journals Connector (OSTI)

......other Symposium of the Society of Japanese Electron Microscopy Coherence of Electron Wave and Contrast of Electron Image Tadatoshi...Measurements, Tohoku University (21) 207 0 Jfc & ft* ffi Coherence of Electron Wave and Contrast of Electron Image Tadatoshi......

Tadatoshi HIBI; Shoichi Takahashi

1964-01-01T23:59:59.000Z

205

Electron  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

to measure the electron density gradient and its fluctuations. Two separate laser beams with slight spatial offset and frequency difference are coupled into a single mixer...

206

Photonics poster small  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Capabilities Capabilities in Solid State Lighting Research and Development of Light-Emitting Diodes (LEDs) and Organic Light-Emitting Diodes (OLEDs) Research & Development Applications Optical Measurements National Center for Electron Microscopy (NCEM) Advanced Light Source (ALS) Research in LEDs Spin casting of OLED Growing Low Defect GaN Crystals to reduce the density of structural defects Minigoniometer viewing LED Optical design of device and packaging Local Lattice Constants and Electric Fields LEDs Research & Development of OLEDs Measurement of spectral power distribution and efficacy of OLED Design and fabrication of luminaires: LED porchlight Electric fields and lattice parameters are simultaneously recorded by the side band and autocorrelation of an electron

207

Electronic and structural properties of the InP(100)(2נ4) surface studied by core-level photoemission and scanning tunneling microscopy  

Science Journals Connector (OSTI)

The (2נ4)-reconstructed InP(100) surfaces have been investigated by scanning tunneling microscopy (STM) and synchrotron-radiation core-level photoelectron spectroscopy. STM observations show that the ?2 model describes the atomic structure of the InP(100)(2נ4) surface in a limited range of the surface-preparation conditions, as predicted theoretically but not previously observed. STM results also support the accuracy of the previously found mixed-dimer structure for the InP(100)(2נ4) surface under less P-rich conditions. A study of P 2p core-level photoelectron spectra, measured with different surface-sensitivity conditions, demonstrates that P 2p photoemission from the mixed-dimer InP(100)(2נ4) surface consists of at least two surface-core-level-shift (SCLS) components which have kinetic energies approximately 0.4eV higher and 0.3eV lower than the bulk emission. On the basis of the surface-sensitivity difference between these SCLSs, they are related to the third-layer and top-layer P sites in the mixed-dimer structure, respectively.

P. Laukkanen; J. Pakarinen; M. Ahola-Tuomi; M. Kuzmin; R.E. Perl; I.J. Vyrynen; A. Tukiainen; V. Rimpilinen; M. Pessa; M. Adell; J. Sadowski

2006-01-01T23:59:59.000Z

208

Strain relief and AlSb buffer layer morphology in GaSb heteroepitaxial films grown on Si as revealed by high-angle annular dark-field scanning transmission electron microscopy  

SciTech Connect (OSTI)

The interfacial misfit (IMF) dislocation array of an epitaxial GaSb film on a Si substrate has been imaged with high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The mismatch strain accommodation through dislocation formation has been investigated using geometric phase analysis (GPA) on HAADF-STEM images with atomic resolution to probe the defects' local strain distribution. These measurements indicate that the lattice parameter of the epitaxial film recovers its bulk value within three unit cells from the interface due to the relaxation through IMF dislocations. The atomic number contrast of the HAADF-STEM images and energy dispersive x-ray spectrometry illustrate the formation of islands of AlSb buffer layer along the interface. The role of the AlSb buffer layer in facilitating the GaSb film growth on Si is further elucidated by investigating the strain field of the islands with the GPA.

Vajargah, S. Hosseini; Couillard, M.; Cui, K. [Department of Material Science and Engineering, McMaster University, 1280 Main St. W., Hamilton, Ontario L8S 4M1 (Canada); Tavakoli, S. Ghanad; Robinson, B.; Kleiman, R. N.; Preston, J. S. [Department of Engineering Physics, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Botton, G. A. [Department of Material Science and Engineering, McMaster University, 1280 Main St. W., Hamilton, Ontario L8S 4M1 (Canada); Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario L8S 4M1 (Canada)

2011-02-21T23:59:59.000Z

209

Analytical electron microscopy investigation of elemental composition and bonding structure at the Sb-doped Ni-fully-silicide/SiO{sub 2} interface  

SciTech Connect (OSTI)

It is very important to control the elemental composition and bonding structure at the gate electrode/gate dielectrics interface in metal-oxide-semiconductor transistor devices because this determines the threshold voltage of the gate electrode. In this study, we investigated the structure at the interface between the antimony (Sb)-doped nickel-fully-silicide gate electrode and SiO{sub 2} dielectrics by employing high-spatial resolution techniques such as energy dispersive x-ray spectroscopy and electron energy-loss spectroscopy using a scanning transmission electron microscope. In one region, we found a thin nickel layer at the NiSi/SiO{sub 2} interface originating from the migration of native oxide at the face of the poly-silicon. In another region, a Sb pileup was detected at the NiSi/SiO{sub 2} interface where the Ni L{sub 3}-edge spectrum showed Ni-Sb bonding, then it was suggested that Sb atoms exist at the bottom of NiSi, substituting for Si atoms in NiSi.

Kawasaki, Naohiko; Sugiyama, Naoyuki; Otsuka, Yuji; Hashimoto, Hideki [Morphological Research Laboratory, Toray Research Center Inc., Otsu, Shiga (Japan); Kurata, Hiroki; Isoda, Seiji [Institute for Chemical Research, Kyoto University, Uji, Kyoto (Japan)

2011-03-15T23:59:59.000Z

210

Electron  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron thermal transport within magnetic islands in the reversed-field pinch a... H. D. Stephens, 1,b D. J. Den Hartog, 1,3 C. C. Hegna, 1,2 and J. A. Reusch 1 1 Department of...

211

Defect microstructural evolution in ion irradiated metallic nanofoils: Kinetic Monte Carlo simulation versus cluster dynamics modeling and in situ transmission electron microscopy experiments  

SciTech Connect (OSTI)

Understanding materials degradation under intense irradiation is important for the development of next generation nuclear power plants. Here we demonstrate that defect microstructural evolution in molybdenum nanofoils in situ irradiated and observed on a transmission electron microscope can be reproduced with high fidelity using an object kinetic Monte Carlo (OKMC) simulation technique. Main characteristics of defect evolution predicted by OKMC, namely, defect density and size distribution as functions of foil thickness, ion fluence and flux, are in excellent agreement with those obtained from the in situ experiments and from previous continuum-based cluster dynamics modeling. The combination of advanced in situ experiments and high performance computer simulation/modeling is a unique tool to validate physical assumptions/mechanisms regarding materials response to irradiation, and to achieve the predictive power for materials stability and safety in nuclear facilities.

Xu Donghua; Wirth, Brian D. [Department of Nuclear Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States); Li Meimei [Division of Nuclear Engineering, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Kirk, Marquis A. [Division of Materials Science, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

2012-09-03T23:59:59.000Z

212

High resolution, high speed ultrahigh vacuum microscopy  

SciTech Connect (OSTI)

The history and future of transmission electron microscopy (TEM) is discussed as it refers to the eventual development of instruments and techniques applicable to the real time in situ investigation of surface processes with high resolution. To reach this objective, it was necessary to transform conventional high resolution instruments so that an ultrahigh vacuum (UHV) environment at the sample site was created, that access to the sample by various in situ sample modification procedures was provided, and that in situ sample exchanges with other integrated surface analytical systems became possible. Furthermore, high resolution image acquisition systems had to be developed to take advantage of the high speed imaging capabilities of projection imaging microscopes. These changes to conventional electron microscopy and its uses were slowly realized in a few international laboratories over a period of almost 40 years by a relatively small number of researchers crucially interested in advancing the state of the art of electron microscopy and its applications to diverse areas of interest; often concentrating on the nucleation, growth, and properties of thin films on well defined material surfaces. A part of this review is dedicated to the recognition of the major contributions to surface and thin film science by these pioneers. Finally, some of the important current developments in aberration corrected electron optics and eventual adaptations to in situ UHV microscopy are discussed. As a result of all the path breaking developments that have led to today's highly sophisticated UHV-TEM systems, integrated fundamental studies are now possible that combine many traditional surface science approaches. Combined investigations to date have involved in situ and ex situ surface microscopies such as scanning tunneling microscopy/atomic force microscopy, scanning Auger microscopy, and photoemission electron microscopy, and area-integrating techniques such as x-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, Auger electron spectroscopy, low-energy electron diffraction, temperature programmed desorption, high-resolution electron energy-loss and Fourier-transform infrared spectroscopies, and others. Material systems ranging from atomic layers of metals and semiconductors to biology related depositions are being investigated. In the case of biological materials, however, strict limitations to high-resolution applications are imposed by electron radiation damage considerations.

Poppa, Helmut [National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)

2004-09-01T23:59:59.000Z

213

Chemical Imaging Analysis of Environmental Particles Using the Focused Ion Beam/Scanning Electron Microscopy Technique: Microanalysis Insights into Atmospheric Chemistry of Fly Ash  

SciTech Connect (OSTI)

Airborne fly ash from coal combustion may represent a source of bioavailable iron (Fe) in the open ocean. However, few studies have been made focusing on Fe speciation and distribution in coal fly ash. In this study, chemical imaging of fly ash has been performed using a dual-beam FIB/SEM (focused ion beam/scanning electron microscope) system for a better understanding of how simulated atmospheric processing modify the morphology, chemical compositions and element distributions of individual particles. A novel approach has been applied for cross-sectioning of fly ash specimen with a FIB in order to explore element distribution within the interior of individual particles. Our results indicate that simulated atmospheric processing causes disintegration of aluminosilicate glass, a dominant material in fly ash particles. Aluminosilicate-phase Fe in the inner core of fly ash particles is more easily mobilized compared with oxide-phase Fe present as surface aggregates on fly ash spheres. Fe release behavior depends strongly on Fe speciation in aerosol particles. The approach for preparation of cross-sectioned specimen described here opens new opportunities for particle microanalysis, particular with respect to inorganic refractive materials like fly ash and mineral dust.

Chen, Haihan; Grassian, Vicki H.; Saraf, Laxmikant V.; Laskin, Alexander

2013-01-21T23:59:59.000Z

214

Electron  

Science Journals Connector (OSTI)

Absolute grand total cross sections(TCSs) for electron-disilane (Si2H6) scattering have been measured over the energy range from 1 to 370eV in a linear transmission experiment. The low-energy TCS is dominated by a broad resonant-like enhancement. In the region of the maximum the present grand TCS values appeared to be distinctly lower than previously reported integral elastic cross section data. A comparison of total electron scattering cross sections for the two simplest silicon hydrides and relevant hydrocarbons is given.

Czeslaw Szmytkowski; Pawel Mozejko; Grzegorz Kasperski

2001-01-01T23:59:59.000Z

215

Electronic  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

contribution contribution to friction on GaAs: An atomic force microscope study Yabing Qi, 1,2 J. Y. Park, 2 B. L. M. Hendriksen, 2 D. F. Ogletree, 2 and M. Salmeron 2,3 1 Applied Science and Technology Graduate Group, University of California, Berkeley, California 94720, USA 2 Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720, USA 3 Department of Materials Sciences and Engineering, University of California, Berkeley, California 94720, USA ͑Received 23 January 2008; revised manuscript received 11 April 2008; published 7 May 2008͒ The electronic contribution to friction at semiconductor surfaces was investigated by using a Pt-coated tip with 50 nm radius in an atomic force microscope sliding against an n-type GaAs͑100͒ substrate. The GaAs surface was covered by an approximately 1 nm thick oxide layer. Charge accumulation

216

Current titles  

SciTech Connect (OSTI)

116 abstracts are presented of work done with the electron microscope. NCEM is a DOE-designated national user facility and is available at no charge to qualified researchers (assess is controlled by a steering committee).

Not Available

1993-04-01T23:59:59.000Z

217

Analytical electron microscopy of rapidly solidified metals  

SciTech Connect (OSTI)

Examples of the need to characterize rapidly solidified metals on submicron scale are given for centrifugally atomized steel powder and electrohydrodynamically atomized submicron spheres. Materials studied include Fe-40wt% Ni, 304 SS, Fe-20at.%Co, and pure V.

Kelly, T.F.; Holzman, L.M.; Shin, K.; Kim, Y.W.; Bae, J.C.; Flinn, J.E.; Camus, P.P.; Melmed, A.J.

1991-12-31T23:59:59.000Z

218

High-resolution scanning transmission electron microscopy  

Science Journals Connector (OSTI)

...where, is the brightness of the source and bs/80 is the ratio of the real image of the...im-age (0.61A/a). The quantity bs/80 can be most easily defined in the source...tube can be ac-quired at a reasonable cost and is com-patible with full-color displays...

AV Crewe

1983-07-22T23:59:59.000Z

219

In situ environmental transmission electron microscopy study...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

aqueous electrolytes. 16 Based on previous studies of the oxida- tion behavior of bulk TiC 17-19 in various temperature ranges, and under various oxygen partial pressures, it is...

220

NC-JRA-001_Electron Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

samples between labs and buildings SBMS Transportation, PPE, training N 1 3 2 2 12 *Risk: 0 to 20 21 to 40 41-60 61 to 80 81 or greater Negligible Acceptable Moderate...

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


221

HIGH STABILITY CURRENT SUPPLY FOR ELECTRON MICROSCOPY  

E-Print Network [OSTI]

Improvements. Dordrecht, The Netherland: Kluwer AcademicESSENTIALS. Dordrecht, The Netherland: Springer, pages 181-

Motamedi, Maryam Melani

2012-01-01T23:59:59.000Z

222

Electron Microscopy of Irradiation Effects in Space  

Science Journals Connector (OSTI)

...frequency of periods of low solar wind energy at the moon. The lowest energy...2000-year periods of high solar wind energy at the moon, with the highest...indication of any change in the mean solar wind energy over geologic time. Solar wind...

M. Maurette; P. B. Price

1975-01-17T23:59:59.000Z

223

Photothermal imaging scanning microscopy  

DOE Patents [OSTI]

Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.

Chinn, Diane (Pleasanton, CA); Stolz, Christopher J. (Lathrop, CA); Wu, Zhouling (Pleasanton, CA); Huber, Robert (Discovery Bay, CA); Weinzapfel, Carolyn (Tracy, CA)

2006-07-11T23:59:59.000Z

224

Feature Article NEXAFS microscopy and resonant scattering  

E-Print Network [OSTI]

and conven- tional electron, X-ray and neutron scattering. We provide an overview of these synchrotron based and derivative struc- tures, ranging from spectroscopy to mechanical analysis and neutron scattering [9,10]. SomeFeature Article NEXAFS microscopy and resonant scattering: Composition and orientation probed

Hitchcock, Adam P.

225

Nonlinear vibrational microscopy  

DOE Patents [OSTI]

The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. Microscopic imaging with a vibrational spectroscopic contrast is achieved by generating signals in a nonlinear optical process and spatially resolved detection of the signals. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a. directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b. collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c. removing the residual beam; and d. detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution then IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers. CARS and SFG microscopy does not rely on the presence of fluorophores, but retains the resolution and three-dimensional sectioning capability of confocal and two-photon fluorescence microscopy. Complementary to these techniques, CARS and SFG microscopy provides a contrast mechanism based on vibrational spectroscopy. This vibrational contrast mechanism, combined with an unprecedented high sensitivity at a tolerable laser power level, provides a new approach for microscopic investigations of chemical and biological samples.

Holtom, Gary R. (Richland, WA); Xie, Xiaoliang Sunney (Richland, WA); Zumbusch, Andreas (Munchen, DE)

2000-01-01T23:59:59.000Z

226

Materials Applications of Photoelectron Emission Microscopy....  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Applications of Photoelectron Emission Microscopy. Materials Applications of Photoelectron Emission Microscopy. Abstract: Photoelectron emission microscopy (PEEM) is a versatile...

227

Biological Imaging by Soft X-Ray Diffraction Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in...

228

SUBMOLECULAR IMAGING OF EPITAXIALLY CRYSTALLIZED HELICAL POLYOLEFINS BY ATOMIC FORCE MICROSCOPY  

E-Print Network [OSTI]

Digital Instruments, Inc., Santa Barbara, Cal. USA. Images were taken with an A­type scan head (max. scan microscopy EM and electron diffraction ED. AFM pictures with high resolution could be obtained when using polypropylene has been determined by electron microscopy EM and electron diffraction ED: chain conformation

Peters, Achim

229

Microscopy. I: A Review  

Science Journals Connector (OSTI)

...indicates the spindle to be an orienting force through which a co-ordinated con tractile...asoT,E. M. and M@&soN,C. W. Handbook of Chemi cal Microscopy. Vol. 1. 1st...498 "586,1950. 164. NAORA, H. Fundamental Studies on the Determination of Desoxypentose-Nucleic...

Robert C. Mellors

1953-02-01T23:59:59.000Z

230

Nuclear emission microscopies B.L. Doyle a,*, D.S. Walsh a  

E-Print Network [OSTI]

Nuclear emission microscopies B.L. Doyle a,*, D.S. Walsh a , S.N. Renfrow a,b , G. Vizkelethy a,1 Abstract Alternatives to traditional nuclear microprobe analysis (NMA) emerged two years ago with the invention of ion electron emission microscopy (IEEM). With nuclear emission microscopy (NEM) the ion beam

231

Instrument Series: Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Quanta 3D FEG Quanta 3D FEG This instrument is now available in EMSL's Radiochemistry Annex. The Quanta 3D FEG is the most versatile high-resolution, low vacuum SEM/FIB for 2D and 3D material characterization and analysis. Featuring three imaging modes - high vacuum, low vacuum and ESEM - it accommodates the widest range of samples of any SEM system. The Quanta 3D FEG's novel, field-emission electron source delivers clear and sharp electron imaging and increased electron beam current enhances EDS and EBSP analysis. This system also offers the capability for in situ study of the dynamic behavior of materials at different humidity levels (up to 100% RH) and temperatures (up to 1500 °C). Quanta 3D FEG's unprecedented high- current FIB enables fast material removal.

232

Probing graphene defects and estimating graphene quality with optical microscopy  

SciTech Connect (OSTI)

We report a simple and accurate method for detecting graphene defects that utilizes the mild, dry annealing of graphene/Cu films in air. In contrast to previously reported techniques, our simple approach with optical microscopy can determine the density and degree of dislocation of defects in a graphene film without inducing water-related damage or functionalization. Scanning electron microscopy, confocal Raman and atomic force microscopy, and X-ray photoelectron spectroscopy analysis were performed to demonstrate that our nondestructive approach to characterizing graphene defects with optimized thermal annealing provides rapid and comprehensive determinations of graphene quality.

Lai, Shen [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Center for Human Interface Nanotechnology (HINT), Suwon 440-746 (Korea, Republic of); Kyu Jang, Sung [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Jae Song, Young, E-mail: yjsong@skku.edu [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Department of Physics, Sungkyunkwan University (SKKU), Suwon 440-746 (Korea, Republic of); Lee, Sungjoo, E-mail: leesj@skku.edu [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Center for Human Interface Nanotechnology (HINT), Suwon 440-746 (Korea, Republic of); College of Information and Communication Engineering, Sungkyunkwan University (SKKU), Suwon 440-746 (Korea, Republic of)

2014-01-27T23:59:59.000Z

233

Introduction to Photoelectron Emission Microscopy: Principles...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Introduction to Photoelectron Emission Microscopy: Principles and Applications. Introduction to Photoelectron Emission Microscopy: Principles and Applications. Abstract: In the...

234

Chapter 11 - Light sheet microscopy  

Science Journals Connector (OSTI)

Abstract This chapter introduces the concept of light sheet microscopy along with practical advice on how to design and build such an instrument. Selective plane illumination microscopy is presented as an alternative to confocal microscopy due to several superior features such as high-speed full-frame acquisition, minimal phototoxicity, and multiview sample rotation. Based on our experience over the last 10 years, we summarize the key concepts in light sheet microscopy, typical implementations, and successful applications. In particular, sample mounting for long time-lapse imaging and the resulting challenges in data processing are discussed in detail.

Michael Weber; Michaela Mickoleit; Jan Huisken

2014-01-01T23:59:59.000Z

235

Iran Thomas Auditorium, 8600 Environmental Transmission Electron...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

April 26, 2012 11:00 am Iran Thomas Auditorium, 8600 Environmental Transmission Electron Microscopy for Catalysis Research: The Example of Carbon Nanotubes Eric A. Stach Center for...

236

X-Ray Diffraction Microscopy of Magnetic Structures  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

X-Ray Diffraction Microscopy of Magnetic Structures Print X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the electron density of complicated molecules. The formula used to make these calculations contains terms that relate to the electron spin of magnetic atoms, but these terms are traditionally ignored since coherent x-ray diffraction has not been used to retrieve magnetic information. Using the full formula allows for the determination of not only the electron density, but also the magnetic spin distribution and its orientation.

237

X-Ray Diffraction Microscopy of Magnetic Structures  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

X-Ray Diffraction Microscopy of Magnetic Structures Print X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the electron density of complicated molecules. The formula used to make these calculations contains terms that relate to the electron spin of magnetic atoms, but these terms are traditionally ignored since coherent x-ray diffraction has not been used to retrieve magnetic information. Using the full formula allows for the determination of not only the electron density, but also the magnetic spin distribution and its orientation.

238

X-Ray Diffraction Microscopy of Magnetic Structures  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

X-Ray Diffraction Microscopy of Magnetic Structures Print X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the electron density of complicated molecules. The formula used to make these calculations contains terms that relate to the electron spin of magnetic atoms, but these terms are traditionally ignored since coherent x-ray diffraction has not been used to retrieve magnetic information. Using the full formula allows for the determination of not only the electron density, but also the magnetic spin distribution and its orientation.

239

Simulating realistic imaging conditions for in situ liquid microscopy  

SciTech Connect (OSTI)

In situ transmission electron microscopy enables the imaging of biological cells, macromolecular protein complexes, nanoparticles, and other systems in a near-native environment. In order to improve interpretation of image contrast features and also predict ideal imaging conditions ahead of time, new virtual electron microscopic techniques are needed. A technique for virtual fluid-stage high-angle annular dark-field scanning transmission electron microscopy with the multislice method is presented that enables the virtual imaging of model fluid-stage systems composed of millions of atoms. The virtual technique is exemplified by simulating images of PbS nanoparticles under different imaging conditions and the results agree with previous experimental findings. General insight is obtained on the influence of the effects of fluid path length, membrane thickness, nanoparticle position, defocus and other microscope parameters on attainable image quality.

Welch, David A.; Faller, Roland; Evans, James E.; Browning, Nigel D.

2013-12-01T23:59:59.000Z

240

ABSTRACTS IN REPORTS CONCERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......relationship was found between the appearance of aerial mycelia, production of soluble pigments...Intestine : Saburo ISHII (Dept. of Anat., Fukushima Med. Col., Sugitsuma-cho, Fukushima) Fukushima J. Med. Sci., 12 (1-2), 67~87......

ABSTRACT

1966-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


241

ABSTRACTS IN REPORTS CONCERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......Kazumi MAEDA (Dept. of Ophth., Osaka Univ. Medical School, Fukushima-ku, Osaka) Folia Ophthalmologica Japonica, 16 (10...Yakuho 166 (3), 28~36 (1965) (in Japanese). Hairy aerial mycelia of certain fungi (Aspergilli and Tricophyton are difficult......

ABSTRACTS

1967-01-01T23:59:59.000Z

242

The 39th Symposium of Japanese Society or Electron Microscopy  

Science Journals Connector (OSTI)

......Department rf Bacteriology...macrophages. A large hmellapodia...density (non-ctathrin...the coated area. 1-4 Three-dimensionaldiitribotioniof...the apical plasma membrane...atereoregularlty, lower thermal expansion...m cost, large amount...diversified Into atmospheric slate, gaseous...beneath the plasma membrane...it was how large area of silver......

Takeshi Hoshino

1995-02-01T23:59:59.000Z

243

Exploring aberration-corrected electron microscopy for compound semiconductors  

Science Journals Connector (OSTI)

......at atomic dimensions. Cryst. Res. Technol. (2005) 40:149-160. doi:10.1002/crat.200410318 . 26 Thust A , Overwijk M H F, Coene W M N, Lentzen M. Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy (1996......

David J. Smith; Toshihiro Aoki; John Mardinly; Lin Zhou; Martha R. McCartney

2013-06-01T23:59:59.000Z

244

In Situ Transmission Electron Microscopy Characterization of Nanomaterials  

E-Print Network [OSTI]

on the grain boundary sliding and grain rotation while the grain boundary interacting with dislocations [7-9]. The discoveries of new nanomaterials such as carbon nanotubes, nanowires and graphene have shown large potential impacts in the developments... with nanometer sized width [18]. Next, graphene nanosheet or thin film can be explained as a two dimensional nanostructured material with nanosized thickness [12, 19]. And finally, bulk nanostructed material can be exampled as a three dimensional...

Lee, Joon Hwan 1977-

2012-11-27T23:59:59.000Z

245

Cryo-Electron Microscopy Structure of Lactococcal Siphophage 1358 Virion  

Science Journals Connector (OSTI)

...cryo-EM, after blotting for 4 s, the grid was plunged into liquid ethane for vitrification...reassembled structure. (C) This 1358 phage hybrid structure was assembled from separately...ANR-11-BSV8-004-01 Lactophages and French Infrastructure for Integrated Structural Biology [FRISBI...

Silvia Spinelli; Cecilia Bebeacua; Igor Orlov; Denise Tremblay; Bruno P. Klaholz; Sylvain Moineau; Christian Cambillau

2014-05-28T23:59:59.000Z

246

Cryo-Electron Microscopy Structure of Lactococcal Siphophage 1358 Virion  

Science Journals Connector (OSTI)

...Finally, we processed this data set with the appropriate helical...conformations. Consequently, our data set included two subsets...analyses and other published data, these decorations might be...ANR-11-BSV8-004-01 Lactophages and French Infrastructure for Integrated Structural Biology...

Silvia Spinelli; Cecilia Bebeacua; Igor Orlov; Denise Tremblay; Bruno P. Klaholz; Sylvain Moineau; Christian Cambillau

2014-05-28T23:59:59.000Z

247

THE ELECTRON MICROSCOPY OF HYDROCARBON PRODUCTION IN PARTHENIUM ARGENTATUM (GUAYULE)  

E-Print Network [OSTI]

conversion of solar energy is the production of hydrocarbonsproduction of hydrocarbons. Mankind's use of biologically converted solar energy

Bauer, T.E.

2010-01-01T23:59:59.000Z

248

The origins and evolution of freeze-etch electron microscopy  

Science Journals Connector (OSTI)

......upon this quite by accident, during a teaching session at the Marine Biology Laboratory in Woods Hole. While explaining the freeze-fracture...filters onto a silver screen, which required our audiences to wear polarizing glasses like people did while watching the old 3D......

John E. Heuser

2011-08-01T23:59:59.000Z

249

DISLOCATION IMAGES IN HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY  

E-Print Network [OSTI]

. There are several dislocation images in the back scattered mode which are distinctly of excess/defect contrast observed in the dark field : two seperate conditions cars. be found. There is a set of dislocations having

Paris-Sud XI, Université de

250

THE ELECTRON MICROSCOPY OF HYDROCARBON PRODUCTION IN PARTHENIUM ARGENTATUM (GUAYULE)  

E-Print Network [OSTI]

in later stages of rubber production will be pre- sentedhas embarked on a rubber production effort designed to useas a crop are its high rubber production~~up to 26% of its

Bauer, T.E.

2010-01-01T23:59:59.000Z

251

Cryogenic Electron Microscopy Study of Nanoemulsion Formation from Microemulsions  

Science Journals Connector (OSTI)

A small amount (?1 ?L) of the sample was applied to a brass planchet (Type A, Ted Pella Inc., Redding, CA) designed for use with a high-pressure-freezer. ... Delmas, T.; Piraux, H.; Couffin, A. C.; Texier, I.; Vinet, F.; Poulin, P.; Cates, M. E.; Bibette, J.How to prepare and stabilize very small nanoemulsions Langmuir 2011, 27, 1683 1692 ...

Han Seung Lee; Eric D. Morrison; Chris D. Frethem; Joseph A. Zasadzinski; Alon V. McCormick

2014-08-20T23:59:59.000Z

252

The use of nonparametric statistics in quantitative electron microscopy  

Science Journals Connector (OSTI)

......w e e n Groups Single Factor Kruskal-Wallis Test (ANOVA), g g 8 12 9 14...i'6" >2 Two Faaor ANOVA Kruskal-Wallis Test (ANOVA) ~ ~ '. ~ ~ 7...The data were evaluated by the Kruskal-Wallis Test. Note that when n = 10......

Randal E. Morris

2000-01-01T23:59:59.000Z

253

Picoscale science and nanoscale engineering by electron microscopy  

Science Journals Connector (OSTI)

......properties of a solid material at a high spatial resolution...situ TEM is becoming an active field of research that is directly related to materials science, nanomechanics...cobalt dioxide (LiCoO2) cathode-and the in situ observation...5-V against a LiCoO2 cathode. The single-crystal......

Zhong Lin Wang

2011-08-01T23:59:59.000Z

254

In Situ Transmission Electron Microscopy Observation of Microstructure...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

This prototype lithium ion battery was built using a single SnO&8322; nanowire as the anode, an air stable salt: lithium bis(trifluoromethansulfonyl) imide (LiTFSI) in a...

255

ABSTRACTS IN REPORTS CONCERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......were examined by means of the fluorescent antibody method. Identification...cerebrospinal fluid by the fluorescent antibody method may contribute...299 Bulbus olfactorius have led to the following con- clusions...after excision of the olfactory bulb, the endoplasmic reticulum......

ABSTRACT

1966-01-01T23:59:59.000Z

256

ABSTRACTS IN REPORTS CONCERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......fixation, might possibly have led to erroneous interpretations...Japanese). Histochemical and fluorescent microscopic ob- servations...enucleation of the ocular bulb at the follow- ing 5 post-irradiation...crystal formation contro'led by the epitaxial effect......

ABSTRACTS

1967-01-01T23:59:59.000Z

257

ABSTRACTS IN REPORTS CONCERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......dehydration. It is thought that the foam cells are playing the main role...electrode is ap- plied through an insulated coaxial cable whose exterior surface is kept at...is supplied through an insulating cable to the 10 stage ac- celerator in......

ABSTRACTS

1967-01-01T23:59:59.000Z

258

In commemoration of Journal of Electron Microscopy's 60th anniversary  

Science Journals Connector (OSTI)

......troublesome for the users could be achieved according to the process on the display, thus greatly improving the ease of operation...aberration corrector (Cs-corrector). With the triggering of commercialization of the Cs-corrector by CEOS in Germany in 1999, a joint......

Yoshiyasu Harada

2011-08-01T23:59:59.000Z

259

ABSTRACTS IN REPORTS CONCERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......HIRATA, Kazuo IWATA (Department of Microbiology, Faculty of Medicine, University of...syndrome; endo- plasmic reticulum in Gilbert's disease; and lyso- some in Wilson's...ITAGAKI (Laboratory of Nutrition and Microbiology, Niigata Women's College, Niigata......

ABSTRACTS

1967-01-01T23:59:59.000Z

260

Study of Polyanilines by High-Resolution Electron Microscopy  

Science Journals Connector (OSTI)

CECM, CNRS, 14 rue Georges Urbain, 94407 Vitry-sur-Seine, France; LADIR, CNRS-Universit Pierre et Marie Curie, 2 rue Henry Dunant 94320 Thiais, France; and DMSC, ONERA, BP 72, 92322 Chatillon, France ...

Lo Mazerolles; Sandrine Folch; Philippe Colomban

1999-11-13T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


261

In-Situ Electron Microscopy of Electrical Energy Storage Materials  

Broader source: Energy.gov [DOE]

2013 DOE Hydrogen and Fuel Cells Program and Vehicle Technologies Program Annual Merit Review and Peer Evaluation Meeting

262

In-Situ Electron Microscopy of Electrical Energy Storage Materials  

Broader source: Energy.gov [DOE]

2011 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies Program Annual Merit Review and Peer Evaluation

263

In-Situ Electron Microscopy of Electrical Energy Storage Materials  

Broader source: Energy.gov [DOE]

2012 DOE Hydrogen and Fuel Cells Program and Vehicle Technologies Program Annual Merit Review and Peer Evaluation Meeting

264

Scanning Electron Microscopy in Concrete Petrography Paul E. Stutzman  

E-Print Network [OSTI]

hydroxide, needle-like habit of ettringite, and the sheet-like habit of calcium- silicate I C-S-H, platy-Type II C-S-H, and ettringite needles. Calcium Hydroxide Ettringite Calcium Hydroxide Ettringite Calcium-Silicate-Hydrate 15 µµm 10 µµm #12;#12;Calcium Hydroxide in Concrete 63 Figure 2

Bentz, Dale P.

265

VOLUME CONTENTS OF JOURNAL OF ELECTRON MICROSCOPY VOL. 14 (1965):  

Science Journals Connector (OSTI)

......in the Urinary Epithelium of Striped Snake (Elaphe quadrivirgata)) Tatsuo EBE...for Embedding with Epoxy Resin at Room Temperature Hiroshi KUSHIDA (275) The Fine Structure...OUTSTANDING LEVEL Consecutive research and development carried on by Hitachi over 26 years in......

Contents of Journal of Electron Microscopy

1965-01-01T23:59:59.000Z

266

ABSTRACTS OF REPORTS CONSERNING ELECTRON MICROSCOPY PUBLISHED IN JAPAN:  

Science Journals Connector (OSTI)

......the tests, the measurements of electric resistance and stress relaxation were carried...lation between the corrosion resistance of anodic oxide films of SAP...namely sphe- roid bodies and elementary granules, are pro- fusely present......

ABSTRACTS

1966-01-01T23:59:59.000Z

267

Uranium-contaminated soils: Ultramicrotomy and electron beam analysis  

SciTech Connect (OSTI)

Uranium contaminated soils from the Fernald Operation Site, Ohio, have been examined by a combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM). A method is described for preparing of transmission electron microscopy (TEM) thin sections by ultramicrotomy. By using these thin sections, SEM and TEM images can be compared directly. Uranium was found in iron oxides, silicates (soddyite), phosphates (autunites), and fluorite. Little uranium was associated with clays. The distribution of uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Dietz, N.L.; Bates, J.K.; Cunnane, J.C.

1994-04-01T23:59:59.000Z

268

3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone at the  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone 3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone at the Nanoscale Scientists studying osteoporosis and other skeletal diseases are interested in the 3D structure of bone and its responses to conditions such as weightlessness, radiation (of particular interest to astronauts) and vitamin D deficiency. The current gold standard, micro-computed tomography (micro-CT), provides 3D images of trabeculae, the small interior struts of bone tissue, and electron microscopy can provide nanometer resolution of thin tissue slices. Hard X-ray transmission microscopy has provided the first 3D view of bone structure within individual trabeculae on the nanoscale. figure 1 Figure 1 Micro-CT (left) shows trabecular structure inside of bone. Transmission X-ray microscopy (TXM; center and right) can reveal localized details of osteocyte lacunae and their processes.

269

Biological Imaging by Soft X-Ray Diffraction Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

270

Biological Imaging by Soft X-Ray Diffraction Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

271

Biological Imaging by Soft X-Ray Diffraction Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

272

Biological Imaging by Soft X-Ray Diffraction Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

273

Microscopy charges ahead | Argonne National Laboratory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Microscopy charges ahead By Jared Sagoff * May 28, 2014 Tweet EmailPrint ARGONNE, Ill. - Ferroelectric materials - substances in which there is a slight and reversible shift of...

274

In-situ spectro-microscopy on organic films: Mn-Phthalocyanine on Ag(100)  

SciTech Connect (OSTI)

Metal phthalocyanines are attracting significant attention, owing to their potential for applications in chemical sensors, solar cells and organic magnets. As the electronic properties of molecular films are determined by their crystallinity and molecular packing, the optimization of film quality is important for improving the performance of organic devices. Here, we present the results of in situ low-energy electron microscopy / photoemission electron microscopy (LEEM/PEEM) studies of incorporation-limited growth [1] of manganese-phthalocyanine (MnPc) on Ag(100) surfaces. MnPc thin films were grown on both, bulk Ag(100) surface and thin Ag(100)/Fe(100) films, where substrate spin-polarized electronic states can be modified through tuning the thickness of the Ag film [2]. We also discuss the electronic structure and magnetic ordering in MnPc thin films, investigated by angle- and spin-resolved photoemission spectroscopy.

Al-Mahboob A.; Vescovo, E.; Sadowski, J.T.

2013-08-18T23:59:59.000Z

275

Nonlinear Dark-Field Microscopy Hayk Harutyunyan,  

E-Print Network [OSTI]

/20/2010 Published on Web: 11/16/2010 FIGURE 1. Illustration of the nonlinear dark-field imaging method. Two incidentNonlinear Dark-Field Microscopy Hayk Harutyunyan, Stefano Palomba, Jan Renger, Romain Quidant Dark-field microscopy is a background-free imaging method that provides high sensitivity and a large

Novotny, Lukas

276

Multiphoton microscopy with near infrared contrast  

E-Print Network [OSTI]

Multiphoton microscopy with near infrared contrast agents Siavash Yazdanfar,a, * Chulmin Joo,a Chun limited to the visible spectrum. We introduce a paradigm for MPM of near-infrared NIR fluorescent Engineers. DOI: 10.1117/1.3420209 Keywords: two-photon microscopy; ultrafast fiber lasers; near-infrared

Larson-Prior, Linda

277

Schmahl, Kirz Receive Compton Award for Contributions to X-ray Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Schmahl, Kirz Received Compton Award for Contributions to X-ray Microscopy Schmahl, Kirz Received Compton Award for Contributions to X-ray Microscopy Image of Compton Award The Advanced Photon Source (APS) and APS Users Organization (APSUO) are very pleased to announce that the 2005 Arthur H. Compton Award was given to Günter Schmahl and Janos Kirz for pioneering and developing the field of x-ray microscopy using Fresnel zone plates. Because of their leadership over the last 30 years, x-ray microscopy has evolved into a powerful method for the study of nanoscale structures and phenomena in many areas of science. Their achievements have opened up productive research avenues in biology, polymers, electronic nanostructures, magnetic materials, meteoritics, and environmental sciences. " Günter Schmahl and Janos Kirz have created a

278

Spectroscopy and atomic force microscopy of biomass  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Spectroscopy Spectroscopy and atomic force microscopy of biomass L. Tetard a,b , A. Passian a,b,n , R.H. Farahi a , U.C. Kalluri c , B.H. Davison c , T. Thundat a,b a Biosciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA b Department of Physics, University of Tennessee, Knoxville, TN 37996, USA c Environmental Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA a r t i c l e i n f o Keywords: Atomic force microscopy Spectroscopy Plant cells Biomass Nanomechanics a b s t r a c t Scanning probe microscopy has emerged as a powerful approach to a broader understanding of the molecular architecture of cell walls, which may shed light on the challenge of efficient cellulosic ethanol production. We have obtained preliminary images of both Populus and switchgrass samples using atomic force microscopy (AFM). The results show distinctive features that are shared by switchgrass

279

Fast scanning two-photon microscopy  

E-Print Network [OSTI]

Fast scanning two-photon microscopy coupled with the use light activated ion channels provides the basis for fast imaging and stimulation in the characterization of in vivo neural networks. A two-photon microscope capable ...

Chang, Jeremy T

2010-01-01T23:59:59.000Z

280

Dark Field Microscopy for Analytical Laboratory Courses  

Science Journals Connector (OSTI)

An innovative and inexpensive optical microscopy experiment for a quantitative analysis or an instrumental analysis chemistry course is described. The students have hands-on experience with a dark field microscope and investigate the wavelength dependence ...

Ashley E. Augspurger; Anthony S. Stender; Kyle Marchuk; Thomas J. Greenbowe; Ning Fang

2014-05-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


281

Photon tunnelling microscopy of polyethylene single crystals  

E-Print Network [OSTI]

Photon tunnelling microscopy of polyethylene single crystals Mohan Srinivasarao* and Richard S:photon tunnellingmicroscopy;single crystals; polyethylene) INTRODUCTION The study of morphology of polymers is an area

Srinivasarao, Mohan

282

Subwavelength optical microscopy in the far field  

E-Print Network [OSTI]

We present a procedure for subwavelength optical microscopy. The identical atoms are distributed on a plane and shined with a standing wave. We rotate the plane to different angles and record the resonant fluorescence spectra in the far field, from...

Sun, Qingqing; Al-Amri, M.; Scully, Marlan O.; Zubairy, M. Suhail.

2011-01-01T23:59:59.000Z

283

MICROSCOPY RESEARCH AND TECHNIQUE 20:371-389 (1992) Developments in the Dynamical Theory of High Energy  

E-Print Network [OSTI]

Energy Electron Reflection Y. MA AND L.D. MARKS Materials Research Center, Northwestern University,Euanston, Illinois 60208 KEY WORDS ABSTRACT High energy electron reflection (HEER) is an important techniqueMICROSCOPY RESEARCH AND TECHNIQUE 20:371-389 (1992) Developments in the Dynamical Theory of High

Marks, Laurence D.

284

Time-resolved observation in transmission electron microscopy by means of spatially resolved electron correlation spectroscopy  

Science Journals Connector (OSTI)

......The cross-sectional diagram and electric field distribution of a Si-APD...the reversed bias and thus the electric field (>10 V/m) accelerates...mechanical nanotubes produced by arc discharge method are now ^kctron intensjty......

Nobuyuki Osakabe; Tetsuji Kodama; Tsuneyuki Urakami; Shinji Ohsuka; Hiroshi Tsuchiya; Yutaka Tsuchiya; Junji Endo; Akira Tonomura

1998-01-01T23:59:59.000Z

285

The Forty-eighth Annual Meeting of the Japanese Society of Electron Microscopy: ELECTRON HOLOGRAPHY  

Science Journals Connector (OSTI)

......development. With time in the liRht the aerated wax-rich Lells at low lifiht intensity form...LHCP II antibody. Aerated dark-Rrown wax-rich cells exposed to normal liRht intensities...beam has been car- ried out on the rector pipeline snpeicomputei CRAY X-MP. The use of......

Akira Tonomura

1992-08-01T23:59:59.000Z

286

The Forty-eighth Annual Meeting of the Japanese Society of Electron Microscopy: ELECTRON HOLOGRAPHY  

Science Journals Connector (OSTI)

......3m-S7-5 HREM OF BaHnOv, WITH OXYGEN-DEFECTIVE STRUCTURE H.Shibahara(l),M.Kawasaki...state. In order to look into oxygen-defective structure and reveal the role of oxygen...the bombarding election beam has been car- ried out on the rector pipeline snpeicomputei......

Akira Tonomura

1992-08-01T23:59:59.000Z

287

The Forty-eighth Annual Meeting of the Japanese Society of Electron Microscopy: ELECTRON HOLOGRAPHY  

Science Journals Connector (OSTI)

......and were loaded with fluorescent calcium indicator, fluo-3...confocal laser microscope, fluorescent dye-cxcludcd spots...tracer. MWI treatment led to the developed silver...glomenUl In rabbit olfactory bulb. Kaxuo Katoh and Kensaku...glomeruK in rabbit olfactory bulb were observed by confocal......

Akira Tonomura

1992-08-01T23:59:59.000Z

288

High-resolution transmission electron microscopy and electron energy loss spectroscopy of doped nanocarbons.  

E-Print Network [OSTI]

??Graphene, a one-atom thick sheet of carbon, is the thinnest, strongest and most electrically conductive material ever discovered. Alongside carbon nanotubes it is part of (more)

Pierce, William Renton

2014-01-01T23:59:59.000Z

289

Study of Interactions Between Microbes and Minerals by Scanning Transmission X-Ray Microscopy (STXM)  

SciTech Connect (OSTI)

Scanning Transmission X-ray Microscopy (STXM) and Transmission Electron Microscopy (TEM) were combined to characterize various samples of geomicrobiological interest down to the nanometer scale. An approach based on energy-filtered imaging was used to examine microbe-mineral interactions and the resulting biominerals, as well as biosignatures in simplified laboratory samples. This approach was then applied to natural samples, including natural biofilms entombed in calcium carbonate precipitates and bioweathered silicates and facilitated location of bacterial cells and provided unique insights about their biogeochemical interactions with minerals at the 30-40 nm scale.

Benzerara, K.; /Paris U., VI-VII, LMCP; Tyliszczak, T.; /LBNL, ALS; Brown, G.E., Jr.; /Stanford U., Geo. Environ. Sci. /SLAC, SSRL

2007-01-03T23:59:59.000Z

290

Biological Imaging by Soft X-Ray Diffraction Microscopy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Biological Imaging by Soft X-Ray Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

291

Advanced Photon Source | Combining Scanning Probe Microscopy and  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

27.2013 27.2013 Researchers from NSLS-II visit SXSPM team at Argonne Synchrotron x-ray scanning tunneling microscopy will soon also be developed at the National Synchrotron Light Source (NSLS-II) at Brookhaven National Laboratory (BNL). In order to establish collaboration between the two National Laboratories, Drs. Evgeny Nazaretski and Hui Yan fom BNL visited Argonne to learn more about recent progress made in the SXSPM project. During the 2-day visit the teams discussed mutual scientific goals and strategies to achieve them. NSLS-II will be a new state-of-the-art, medium-energy electron storage ring at BNL designed to deliver high intensity and brightness. Construction of the NSLS-II's ring building began in March 2009. The new facility will begin operating in 2014

292

Mapping defects in a carbon nanotube by momentum transfer dependent electron energy loss spectromicroscopy  

E-Print Network [OSTI]

Mapping defects in a carbon nanotube by momentum transfer dependent electron energy loss nanotubes Electron microscopy Electron energy loss spectroscopy q-dependence Electron linear dichroism a b s t r a c t Momentum resolved electron energy loss (EELS) spectra of multi-walled carbon nanotubes

Hitchcock, Adam P.

293

Spatial resolution in vector potential photoelectron microscopy  

SciTech Connect (OSTI)

The experimental spatial resolution of vector potential photoelectron microscopy is found to be much higher than expected because of the cancellation of one of the expected contributions to the point spread function. We present a new calculation of the spatial resolution with support from finite element ray tracing, and experimental results.

Browning, R. [R. Browning Consultants, 1 Barnhart Place, Shoreham, New York 11786 (United States)] [R. Browning Consultants, 1 Barnhart Place, Shoreham, New York 11786 (United States)

2014-03-15T23:59:59.000Z

294

Physical sectioning in 3D biological microscopy  

E-Print Network [OSTI]

developed in the Brain Networks Laboratory at Texas A&M University, has been used for the purpose of this study. However, the modes of characterizing chatter and its measurement are equally applicable to all current variants of 3D biological microscopy using...

Guntupalli, Jyothi Swaroop

2008-10-10T23:59:59.000Z

295

Physical sectioning in 3D biological microscopy  

E-Print Network [OSTI]

developed in the Brain Networks Laboratory at Texas A&M University, has been used for the purpose of this study. However, the modes of characterizing chatter and its measurement are equally applicable to all current variants of 3D biological microscopy using...

Guntupalli, Jyothi Swaroop

2009-05-15T23:59:59.000Z

296

Phase sensitivity of slow electrons to interactions with weak potentials  

SciTech Connect (OSTI)

The interaction of very slow electrons with weak potentials is investigated in an exactly soluble, one-dimensional quantum mechanical model. Slow electrons are produced by a decelerating ramp potential, as in experimental mirror electron microscopy, so the electrons can interact with a weak field as they slow and reverse direction. Our model provides a wave mechanical interpretation of this turning point region and suggests the possibility of imaging optical fields utilizing the phase of electron matter waves.

Kennedy, S. M.; Jesson, D. E.; Morgan, M. J.; Smith, A. E.; Barker, P. F. [School of Physics, Monash University, Victoria, 3800 (Australia); Department of Physics, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh, EH144AS (United Kingdom)

2006-10-15T23:59:59.000Z

297

Dispersion compensation for attosecond electron pulses  

SciTech Connect (OSTI)

We propose a device to compensate for the dispersion of attosecond electron pulses. The device uses only static electric and magnetic fields and therefore does not require synchronization to the pulsed electron source. Analogous to the well-known optical dispersion compensator, an electron dispersion compensator separates paths by energy in space. Magnetic fields are used as the dispersing element, while a Wien filter is used for compensation of the electron arrival times. We analyze a device with a size of centimeters, which can be applied to ultrafast electron diffraction and microscopy, and fundamental studies.

Hansen, Peter; Baumgarten, Cory; Batelaan, Herman; Centurion, Martin [Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, Nebraska 68588 (United States)

2012-08-20T23:59:59.000Z

298

Quantitative imaging of living cells by deep ultraviolet microscopy  

E-Print Network [OSTI]

Developments in light microscopy over the past three centuries have opened new windows into cell structure and function, yet many questions remain unanswered by current imaging approaches. Deep ultraviolet microscopy ...

Zeskind, Benjamin J

2006-01-01T23:59:59.000Z

299

Graphene on Ru(0001) Moire Corrugation Studied by Scanning Tunneling Microscopy on Au/Graphene/Ru(0001) Heterostructures  

E-Print Network [OSTI]

Graphene on Ru(0001) Moire Corrugation Studied by Scanning Tunneling Microscopy on Au/Graphene on graphene/Ru(0001) were used to study the corrugation of the moire structure of graphene/Ru(0001 for the graphene/Ru(0001) moire is of structural nature rather than electronic. STM showed a large value

Ciobanu, Cristian

300

Direct observation of temperature dependent magnetic domain structure of the multiferroic La{sub 0.66}Sr{sub 0.34}MnO{sub 3}/BiFeO{sub 3} bilayer system by x-ray linear dichroism- and x-ray magnetic circular dichroism-photoemission electron microscopy  

SciTech Connect (OSTI)

Low-thickness La{sub 0.66}Sr{sub 0.34}MnO{sub 3} (LSMO)/BiFeO{sub 3} (BFO) thin film samples deposited on SrTiO{sub 3} were imaged by high resolution x-ray microscopy at different temperatures. The ultra-thin thickness of the top layer allows to image both the ferromagnetic domain structure of LSMO and the multiferroic domain structure of the buried BFO layer, opening a path to a direct observation of coupling at the interface on a microscopic level. By comparing the domain size and structure of the BFO and LSMO, we observed that, in contrast to LSMO single layers, LSMO/BFO multilayers show a strong temperature dependence of the ferromagnetic domain structure of the LSMO. Particularly, at 40?K, a similar domain size for BFO and LSMO is observed. This indicates a persistence of exchange coupling on the microscopic scale at a temperature, where the exchange bias as determined by magnetometer measurements is vanishing.

Mix, C.; Finizio, S.; Jakob, G.; Klui, M. [Institut fr Physik, Johannes Gutenberg Universitt Mainz, Staudingerweg 7, D-55128 Mainz (Germany); Buzzi, M.; Nolting, F. [Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); Kronast, F. [Helmholtz-Zentrum-Berlin fr Materialien und Energie GmbH, Albert-Einstein Strae 15, D-12489 Berlin (Germany)

2014-05-21T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


301

Argonne CNM: X-Ray Microscopy Capabilities  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

X-Ray Microscopy Facilities X-Ray Microscopy Facilities The Hard X-Ray Nanoprobe (HXN) facility provides scanning fluorescence, scanning diffraction, and full-field transmission and tomographic imaging capabilities with a spatial resolution of 30 nm over a spectral range of 6-12 keV. Modes of Operation Full-Field Transmission Imaging and Nanotomography X-ray transmission imaging uses both the absorption and phase shift of the X-ray beam by the sample as contrast mechanisms. Absorption contrast is used to map the sample density. Elemental constituents can be located by using differential edge contrast in this mode. Phase contrast can be highly sensitive to edges and interfaces even when the X-ray absorption is weak. These contrast mechanisms are exploited to image samples rapidly in full-field transmission mode under various environmental conditions, or combined with nanotomography methods to study the three-dimensional structure of complex and amorphous nanomaterials with the HXN.

302

Attachment of Salmonella on cantaloupe and effect of electron beam irradiation on quality and safety of sliced cantaloupe  

E-Print Network [OSTI]

effectively by irradiation but there was no significant effect on reduction of yeasts. Our results show that electron beam irradiation in combination with chemical sanitizers is effective in decontamination of fresh-cut produce. Electron microscopy images...

Palekar, Mangesh Prafull

2006-04-12T23:59:59.000Z

303

Thermal expansion recovery microscopy: Practical design considerations  

SciTech Connect (OSTI)

A detailed study of relevant parameters for the design and operation of a photothermal microscope technique recently introduced is presented. The technique, named thermal expansion recovery microscopy (ThERM) relies in the measurement of the defocusing introduced by a surface that expands and recovers upon the heating from a modulated source. A new two lens design is presented that can be easily adapted to commercial infinite conjugate microscopes and the sensitivity to misalignment is analyzed. The way to determine the beam size by means of a focus scan and the use of that same scan to verify if a thermoreflectance signal is overlapping with the desired ThERM mechanism are discussed. Finally, a method to cancel the thermoreflectance signal by an adequate choice of a nanometric coating is presented.

Mingolo, N., E-mail: nmingol@fi.uba.ar; Martnez, O. E. [Facultad de Ingeniera, Universidad de Buenos Aires, Paseo Colon 850, 1063 Buenos Aires (Argentina)] [Facultad de Ingeniera, Universidad de Buenos Aires, Paseo Colon 850, 1063 Buenos Aires (Argentina)

2014-01-15T23:59:59.000Z

304

Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam  

Science Journals Connector (OSTI)

................................... 8 Overwijk MHF, vanden Heuvel FC, and Bulle-Lieuwma CWT(1993) Novel scheme for the preparation of transmission electron microscopy......

Zhou-Guang Wang; Naoko Kato; Katsuhiro Sasaki; Tsukasa Hirayama; Hiroyasu Saka

2004-04-01T23:59:59.000Z

305

Nanoscale chemical imaging using synchrotron x-ray enhanced scanning tunneling microscopy  

SciTech Connect (OSTI)

The combination of synchrotron radiation with scanning tunneling microscopy provides a promising new concept for chemical imaging of nanoscale structures. It employs detection of local x-ray absorption, which directly yields chemical, electronic, and magnetic sensitivity. The study of the tip current in the far field (800 nm tip/sample separation) shows that insulator-coated tips have to be considered in order to reduce the background from stray photoelectron. A picture of the different channels contributing to the x-ray enhanced STM process is proposed. If during electron tunneling the sample is illuminated with monochromatic x-rays, characteristic absorption will arise, and core electrons are excited, which might modulate the conventional tunnel current and facilitate chemical imaging at the nanoscale.

Rose, Volker; Freeland, John W. [Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

2010-06-23T23:59:59.000Z

306

Scanning tunnelling microscopy of carbon nanotubes  

Science Journals Connector (OSTI)

...sheet into a cylinder where the car- bon lattice is joined seamlessly...consist of at least a pair of defective rings, e.g. squares, pentagons...sized (Meunier et al. 1999), defective (Meunier & Lambin 1998, 2000...Blase, X., Devita, A. & Car, R. 1997 Electronic structure...

2004-01-01T23:59:59.000Z

307

Electron Transfer  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

3 3 Pierre Kennepohl1,2 and Edward Solomon1* 1Department of Chemistry, Stanford University, Stanford, CA 94305 Electron transfer, or the act of moving an electron from one place to another, is amongst the simplest of chemical processes, yet certainly one of the most critical. The process of efficiently and controllably moving electrons around is one of the primary regulation mechanisms in biology. Without stringent control of electrons in living organisms, life could simply not exist. For example, photosynthesis and nitrogen fixation (to name but two of the most well-known biochemical activities) are driven by electron transfer processes. It is unsurprising, therefore, that much effort has been placed on understanding the fundamental principles that control and define the simple act of adding and/or removing electrons from chemical species.

308

Atom chip microscopy: A novel probe for strongly correlated materials  

SciTech Connect (OSTI)

Improved measurements of strongly correlated systems will enable the predicative design of the next generation of supermaterials. In this program, we are harnessing recent advances in the quantum manipulation of ultracold atomic gases to expand our ability to probe these technologically important materials in heretofore unexplored regions of temperature, resolution, and sensitivity parameter space. We are working to demonstrate the use of atom chips to enable single-shot, large area detection of magnetic flux at the 10^-7 flux quantum level and below. By harnessing the extreme sensitivity of atomic clocks and Bose-Einstein condensates (BECs) to external perturbations, the cryogenic atom chip technology developed here will provide a magnetic flux detection capability that surpasses other techniques---such as scanning SQUIDs---by a factor of 10--1000. We are testing the utility of this technique by using rubidium BECs to image the magnetic fields emanating from charge transport and magnetic domain percolation in strongly correlated materials as they undergo temperature-tuned metal--to--insulator phase transitions. Cryogenic atom chip microscopy introduces three very important features to the toolbox of high-resolution, strongly correlated material microscopy: simultaneous detection of magnetic and electric fields (down to the sub-single electron charge level); no invasive large magnetic fields or gradients; simultaneous micro- and macroscopic spatial resolution; freedom from 1/f flicker noise at low frequencies; and, perhaps most importantly, the complete decoupling of probe and sample temperatures. The first of these features will play an important role in studying the interplay between magnetic and electric domain structure. The last two are crucial for low frequency magnetic noise detection in, e.g., the cuprate pseudogap region and for precision measurements of transport in the high temperature, technologically relevant regime inaccessible to other techniques based on superconducting scanning probes. In periods 1--3 of this grant, which we now close at the University of Illinois at Urbana-Champaign and restart at Stanford University where our new lab is being built, we have demonstrated the ability to rapidly create Rb BECs and trap them within microns of a surface ina cryostat. Period 4 of this grant, to be performed at Stanford, will demonstrate the feasibility of using atom chips with a BEC to image transport features on a cryogenically cooled surface. Successful demonstration, in future funding cycles, will lead directly to the use of system for studies of transport in exotic and technologically relevant materials such as cuprate superconductors and topological insulators.

Lev, Benjamin L

2011-11-03T23:59:59.000Z

309

Quantum Phase Extraction in Isospectral Electronic Nanostructures  

SciTech Connect (OSTI)

Quantum phase is not a direct observable and is usually determined by interferometric methods. We present a method to map complete electron wave functions, including internal quantum phase information, from measured single-state probability densities. We harness the mathematical discovery of drum-like manifolds bearing different shapes but identical resonances, and construct quantum isospectral nanostructures possessing matching electronic structure but divergent physical structure. Quantum measurement (scanning tunneling microscopy) of these 'quantum drums' [degenerate two-dimensional electron states on the Cu(111) surface confined by individually positioned CO molecules] reveals that isospectrality provides an extra topological degree of freedom enabling robust quantum state transplantation and phase extraction.

Moon, Christopher

2010-04-28T23:59:59.000Z

310

Characterisation of Hadley grains by confocal microscopy  

Science Journals Connector (OSTI)

This work forms part of an exploratory study to investigate the use of fluorescent laser scanning confocal microscopy (LSCM) for imaging pores and voids in hardened mortar and concrete. The study has revealed the suitability of the technique for the characterisation of hollow shell (Hadley) hydration grains (these are grains that contain a void within the original boundary of the cement grain). It was found that Hadley grains could be imaged using fluorescent light techniques, subsequent to their impregnation by epoxy resin doped with a fluorescent dye. Prior to this work, it was not clear whether hollow grains were impregnated due to connections with capillary pores, or if they had been impregnated due to connections with damage caused during surface preparation (i.e. micro-cracks or deep surface scratches). However using the 3D LSCM imaging technique it was observed that connections between Hadley grains and hardened cement paste (HCP) capillary pores did exist, in different forms, at depths well below the surface providing conduits along which resin was able to flow and impregnate the hollow grains. Other aspects of imaging Hadley grains are also described, such as the sectioning of tips of larger grains often taken as separate smaller pores or grains in 2D images.

M.K. Head; H.S. Wong; N.R. Buenfeld

2006-01-01T23:59:59.000Z

311

Atomic-force-microscopy observations of tracks induced by swift Kr ions in mica  

Science Journals Connector (OSTI)

For the first time, latent tracks induced by swift Kr ions have been directly observed in mica. These tracks are imaged by atomic-force microscopy as hollows which are associated with softer areas in the mica surface. The track core is formed by disordered mica. The mean diameter of the observed hollows increases with the electronic stopping power of the ions. The track shape along the ion path is deduced from the analysis of both the number of the tracks per unit area and their diameter distribution. These observations are the first images of nanometric changes of elastic properties.

F. Thibaudau; J. Cousty; E. Balanzat; S. Bouffard

1991-09-16T23:59:59.000Z

312

Front-side bombarded metal plated CMOS electron sensors Hod Finkelstein1  

E-Print Network [OSTI]

-light-level imaging to astronomy, electron microscopy, and nuclear instrumentation. The majority of these detectors is multiplied. The electrons are accelerated onto a phosphor screen, by means of which the electrons above are eliminated. The EBCCD is incorporated into the vacuum tube with the photocathode. The emitted

Ginosar, Ran

313

Extracellular Proteins Promote Zinc Sulfide Aggregation  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Extracellular Proteins Promote Zinc Sulfide Aggregation Print Extracellular Proteins Promote Zinc Sulfide Aggregation Print Researchers from the ALS, Berkeley Lab's National Center for Electron Microscopy (NCEM), and Lawrence Livermore National Laboratory analyzed biofilm samples rich in zinc sulfide and dominated by sulfate-reducing bacteria, which were collected from lead-zinc mine waters. The researchers were curious about the relationship of the organic material and metals, particularly how organics affect mobility, and its potential for bioremediation. It is known that some organics promote aggregation. Amine-bearing molecules, for example, can organize sulfide nanoparticles into semiconductor nanowires. The research team used a series of imaging techniques and detectors to analyze aggregates of biogenic zinc sulfide nanocrystals in the biofilms. Their examination yielded excellent results and some surprises. They were able to prove that natural organic matter promotes dense aggregation of the zinc sulfide nanocrystals into much larger spheroids and that the organic matter is preserved in nanometer-scale pores in the spheroids. What was not expected was the presence of proteins in the spheroids, making them a key component in aggregation and an example of extracellular biomineralization.

314

Extracellular Proteins Promote Zinc Sulfide Aggregation  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Extracellular Proteins Promote Extracellular Proteins Promote Zinc Sulfide Aggregation Extracellular Proteins Promote Zinc Sulfide Aggregation Print Wednesday, 26 September 2007 00:00 Researchers from the ALS, Berkeley Lab's National Center for Electron Microscopy (NCEM), and Lawrence Livermore National Laboratory analyzed biofilm samples rich in zinc sulfide and dominated by sulfate-reducing bacteria, which were collected from lead-zinc mine waters. The researchers were curious about the relationship of the organic material and metals, particularly how organics affect mobility, and its potential for bioremediation. It is known that some organics promote aggregation. Amine-bearing molecules, for example, can organize sulfide nanoparticles into semiconductor nanowires. The research team used a series of imaging techniques and detectors to analyze aggregates of biogenic zinc sulfide nanocrystals in the biofilms. Their examination yielded excellent results and some surprises. They were able to prove that natural organic matter promotes dense aggregation of the zinc sulfide nanocrystals into much larger spheroids and that the organic matter is preserved in nanometer-scale pores in the spheroids. What was not expected was the presence of proteins in the spheroids, making them a key component in aggregation and an example of extracellular biomineralization.

315

Extracellular Proteins Promote Zinc Sulfide Aggregation  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Extracellular Proteins Promote Zinc Sulfide Aggregation Print Extracellular Proteins Promote Zinc Sulfide Aggregation Print Researchers from the ALS, Berkeley Lab's National Center for Electron Microscopy (NCEM), and Lawrence Livermore National Laboratory analyzed biofilm samples rich in zinc sulfide and dominated by sulfate-reducing bacteria, which were collected from lead-zinc mine waters. The researchers were curious about the relationship of the organic material and metals, particularly how organics affect mobility, and its potential for bioremediation. It is known that some organics promote aggregation. Amine-bearing molecules, for example, can organize sulfide nanoparticles into semiconductor nanowires. The research team used a series of imaging techniques and detectors to analyze aggregates of biogenic zinc sulfide nanocrystals in the biofilms. Their examination yielded excellent results and some surprises. They were able to prove that natural organic matter promotes dense aggregation of the zinc sulfide nanocrystals into much larger spheroids and that the organic matter is preserved in nanometer-scale pores in the spheroids. What was not expected was the presence of proteins in the spheroids, making them a key component in aggregation and an example of extracellular biomineralization.

316

Microcalorimeter-type energy dispersive X-ray spectrometer for a transmission electron microscope  

Science Journals Connector (OSTI)

......Microscopy (1986) New York: Plenum Press. 4...Garratt-Reed A J , Bell D C. Energy-Dispersive X-ray...Microscopy (1996) New York: Plenum Press. 19...Microcalorimeter-type energy dispersive X-ray...electron microscope. | A new energy dispersive......

Toru Hara; Keiichi Tanaka; Keisuke Maehata; Kazuhisa Mitsuda; Noriko Y. Yamasaki; Mitsuaki Ohsaki; Katsuaki Watanabe; Xiuzhen Yu; Takuji Ito; Yoshihiro Yamanaka

2010-02-01T23:59:59.000Z

317

Polarized Electrons  

Science Journals Connector (OSTI)

Since 1972, when the last survey of Polarized Electrons was presented at an International Conference on Atomic Physics, the field has progressed to the point where it has entered a new phase, one which, I beli...

M. S. Lubell

1977-01-01T23:59:59.000Z

318

Electron Bernstein  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

, where pe 2 e 2 n e 0 m e is the plasma frequency and ce eBm e is the cyclotron frequency. However, the elec- trostatic electron Bernstein wave EBW does...

319

X-ray optics for scanning fluorescence microscopy and other applications  

SciTech Connect (OSTI)

Scanning x-ray fluorescence microscopy is analogous to scanning electron microscopy. Maps of chemical element distribution are produced by scanning with a very small x-ray beam. Goal is to perform such scanning microscopy with resolution in the range of <1 to 10 {mu}m, using standard laboratory x-ray tubes. We are investigating mirror optics in the Kirkpatrick-Baez (K-B) configuration. K-B optics uses two curved mirrors mounted orthogonally along the optical axis. The first mirror provides vertical focus, the second mirror provides horizontal focus. We have used two types of mirrors: synthetic multilayers and crystals. Multilayer mirrors are used with lower energy radiation such as Cu K{alpha}. At higher energies such as Ag K{alpha}, silicon wafers are used in order to increase the incidence angles and thereby the photon collection efficiency. In order to increase the surface area of multilayers which reflects x-rays at the Bragg angle, we have designed mirrors with the spacing between layers graded along the optic axis in order to compensate for the changing angle of incidence. Likewise, to achieve a large reflecting surface with silicon, the wafers are placed on a specially designed lever arm which is bent into a log spiral by applying force at one end. In this way, the same diffracting angle is maintained over the entire surface of the wafer, providing a large solid angle for photon collection.

Ryon, R.W. [Lawrence Livermore National Lab., CA (United States); Warburton, W.K. [X-Ray Instrumentation Associates, Menlo Park, CA (United States)

1992-05-01T23:59:59.000Z

320

Metallic glass electronic structure peculiarities revealed by UHV STM/STS  

Science Journals Connector (OSTI)

We present the results of ultrahigh vacuum scanning tunneling microscopy/spectroscopy investigation of metallic glass surface. The topography and electronic structure of Ni63.5Nb36.5 have been studied. A great nu...

A. I. Oreshkin; N. S. Maslova; V. N. Mantsevich; S. I. Oreshkin

2011-09-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


321

Modulated microwave microscopy and probes used therewith  

DOE Patents [OSTI]

A microwave microscope including a probe tip electrode vertically positionable over a sample and projecting downwardly from the end of a cantilever. A transmission line connecting the tip electrode to the electronic control system extends along the cantilever and is separated from a ground plane at the bottom of the cantilever by a dielectric layer. The probe tip may be vertically tapped near or at the sample surface at a low frequency and the microwave signal reflected from the tip/sample interaction is demodulated at the low frequency. Alternatively, a low-frequency electrical signal is also a non-linear electrical element associated with the probe tip to non-linearly interact with the applied microwave signal and the reflected non-linear microwave signal is detected at the low frequency. The non-linear element may be semiconductor junction formed near the apex of the probe tip or be an FET formed at the base of a semiconducting tip.

Lai, Keji; Kelly, Michael; Shen, Zhi-Xun

2012-09-11T23:59:59.000Z

322

Simulation of electron-matter interaction during wet-STEM electron tomography  

SciTech Connect (OSTI)

Tomography is an efficient tool to probe the 3 dimensional (3D) structure of materials. In the laboratory, a device has been developed to perform electron tomography in an environmental scanning electron microscopy (ESEM). The configuration of Scanning Transmission Electron Microscopy (STEM) in Environmental Scanning Electron Microscopy (ESEM) provides a novel approach for the characterization of the 3D structure of materials and optimizes a compromise between the resolution level of a few nm and the large tomogram due to the high thickness of transparency. Moreover, STEM allows the observation in 2D of wet samples in an ESEM by finely controlling the sample temperature and the water pressure of the sample environment. It has been recently demonstrated that it was possible to acquire image series of hydrated objects and thus to attain 3D characterization of wet samples. In order to get reliable and quantitative data, the present study deals with the simulation of electron-matter interactions. From such simulation on the MCM-41 material, we determine the minimum quantity of water layer which can be detected on wet materials.

Septiyanto, Rahmat Firman, E-mail: karine.masenelli-varlot@insa-lyon.fr [MATEIS, INSA-Lyon, CNRS UMR5510, F-69621, France and Physics of Electronic Material, Departement of Physics, Faculty of Mathematic and Natural Sciences, ITB Jalan Ganesha No. 10, Bandung 40132 (Indonesia); Masenelli-Varlot, Karine [MATEIS, INSA-Lyon, CNRS UMR5510, F-69621 (France); Iskandar, Ferry [Physics of Electronic Material, Departement of Physics, Faculty of Mathematic and Natural Sciences, ITB Jalan Ganesha No. 10, Bandung 40132 (Indonesia)

2014-02-24T23:59:59.000Z

323

Surface [4 + 2] Cycloaddition Reaction of Thymine on Si(111)77 Observed by Scanning Tunneling Microscopy  

Science Journals Connector (OSTI)

WATLab and Department of Chemistry, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada ... Simple hydrocarbons(1) with aliphatic chain backbones, alkenes, alkynes, and aromatic molecules without and with heteroatoms(3) have been investigated by a number of experimental methods, including X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), high-resolution electron energy loss spectroscopy (HREELS), and scanning tunneling microscopy (STM) as well as computational methods based on density functional theory (DFT), MollerPlesset perturbation theory (MP2), and semiempirical techniques. ...

A. Chatterjee; L. Zhang; K. T. Leung

2013-06-21T23:59:59.000Z

324

Mapping Ionic Currents and Reactivity on the Nanoscale: Electrochemical Strain Microscopy  

SciTech Connect (OSTI)

Solid-state electrochemical processes in oxides underpin a broad spectrum of energy and information storage devices, ranging from Li-ion and Li-air batteries, to solid oxide fuel cells (SOFC) to electroresistive and memristive systems. These functionalities are controlled by the bias-driven diffusive and electromigration transport of mobile ionic species, as well as intricate a set of electrochemical and defect-controlled reactions at interfaces and in bulk. Despite the wealth of device-level and atomistic studies, little is known on the mesoscopic mechanisms of ion diffusion and electronic transport on the level of grain clusters, individual grains, and extended defects. The development of the capability for probing ion transport on the nanometer scale is a key to deciphering complex interplay between structure, functionality, and performance in these systems. Here we introduce Electrochemical Strain Microscopy, a scanning probe microscopy technique based on strong strain-bias coupling in the systems in which local ion concentrations are changed by electrical fields. The imaging capability, as well as time- and voltage spectroscopies analogous to traditional current based electrochemical characterization methods are developed. The reversible intercalation of Li and mapping electrochemical activity in LiCoO2 is demonstrated, illustrating higher Li diffusivity at non-basal planes and grain boundaries. In Si-anode device structure, the direct mapping of Li diffusion at extended defects and evolution of Li-activity with charge state is explored. The electrical field-dependence of Li mobility is studied to determine the critical bias required for the onset of electrochemical transformation, allowing reaction and diffusion processes in the battery system to be separated at each location. Finally, the applicability of ESM for probing oxygen vacancy diffusion and oxygen reduction/evolution reactions is illustrated, and the high resolution ESM maps are correlated with aberration corrected scanning transmission electron microscopy imaging. The future potential for deciphering mechanisms of electrochemical transformations on an atomically-defined single-defect level is discussed.

Kalinin, S.V. (Center for Nanophase Materials Sciences, ORNL) [Center for Nanophase Materials Sciences, ORNL

2010-10-19T23:59:59.000Z

325

Electron Impedances  

SciTech Connect (OSTI)

It is only recently, and particularly with the quantum Hall effect and the development of nanoelectronics, that impedances on the scale of molecules, atoms and single electrons have gained attention. In what follows the possibility that characteristic impedances might be defined for the photon and the single free electron is explored is some detail, the premise being that the concepts of electrical and mechanical impedances are relevant to the elementary particle. The scale invariant quantum Hall impedance is pivotal in this exploration, as is the two body problem and Mach's principle.

P Cameron

2011-12-31T23:59:59.000Z

326

Sub-Kelvin scanning tunneling microscopy on magnetic molecules.  

E-Print Network [OSTI]

??Magnetic molecules have attracted lots interest. In this work, an ultra-stable and low noise scanning tunneling microscopy operating at 400 mK using He-3 (930 mK (more)

Zhang, Lei

2012-01-01T23:59:59.000Z

327

Measuring Shear Stress in Microfluidics using Traction Force Microscopy  

Science Journals Connector (OSTI)

Traction force microscopy is a previously-developed method to measure shear forces exerted by biological cells on substrates to which they are adhered (Dembo, 1999). The technique determines the shear stress a...

Bryant Mueller

2011-01-01T23:59:59.000Z

328

X-Ray Diffraction Microscopy of Magnetic Structures  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing...

329

Doppler optical coherence microscopy for studies of cochlear mechanics  

E-Print Network [OSTI]

The possibility of measuring subnanometer motions with micron scale spatial resolution in the intact mammalian cochlea using Doppler optical coherence microscopy (DOCM) is demonstrated. A novel DOCM system is described ...

Hong, Stanley S.

330

Fast live simultaneous multiwavelength four-dimensional optical microscopy  

Science Journals Connector (OSTI)

...between excitation power and sensitivity...throughput of both systems. Most modern microscopy systems have excellent...connected to a power source (Bioptechs...Pawley JB ( 2006 ) Handbook of Biological Confocal...image sequence restoration . IEEE T Pattern...

Peter M. Carlton; Jrme Boulanger; Charles Kervrann; Jean-Baptiste Sibarita; Jean Salamero; Susannah Gordon-Messer; Debra Bressan; James E. Haber; Sebastian Haase; Lin Shao; Lukman Winoto; Atsushi Matsuda; Peter Kner; Satoru Uzawa; Mats Gustafsson; Zvi Kam; David A. Agard; John W. Sedat

2010-01-01T23:59:59.000Z

331

Fluorescence microscopy with diffraction resolution barrier broken by stimulated emission  

Science Journals Connector (OSTI)

...intracavity frequency doubler. This system partly converted the Ti:Sapphire...the focused time-averaged power. The axial...processing. Computational image restoration can in addition improve...light. 1 Pawley J ( 1995 ) Handbook of Biological Confocal Microscopy...

Thomas A. Klar; Stefan Jakobs; Marcus Dyba; Alexander Egner; Stefan W. Hell

2000-01-01T23:59:59.000Z

332

Carmichael's Concise Review Microscopy is Only Skin Deep  

E-Print Network [OSTI]

Carmichael's Concise Review Microscopy is Only Skin Deep Stephen W. Carmichael Mayo Clinic. Coming Events 2011 EMAS 2011 May 15­19, 2011 Angers, France www.emas-web.net IUMAS-V May 22­27, 2011

Heller, Eric

333

Measurement of vibrational spectrum of liquid using monochromated scanning transmission electron microscopyelectron energy loss spectroscopy  

Science Journals Connector (OSTI)

......application to lithium-ion battery and hence has been well studied...Atom-by-atom spectroscopy at graphene edge. Nature (2010) 468...temperature molten salts as lithium battery electrolyte. Electrochim...additive systems as lithium-ion battery ionic liquid electrolytes......

Tomohiro Miyata; Mao Fukuyama; Akihide Hibara; Eiji Okunishi; Masaki Mukai; Teruyasu Mizoguchi

2014-10-01T23:59:59.000Z

334

Toward single cell traction microscopy within 3D collagen matrices  

SciTech Connect (OSTI)

Mechanical interaction between the cell and its extracellular matrix (ECM) regulates cellular behaviors, including proliferation, differentiation, adhesion, and migration. Cells require the three-dimensional (3D) architectural support of the ECM to perform physiologically realistic functions. However, current understanding of cellECM and cellcell mechanical interactions is largely derived from 2D cell traction force microscopy, in which cells are cultured on a flat substrate. 3D cell traction microscopy is emerging for mapping traction fields of single animal cells embedded in either synthetic or natively derived fibrous gels. We discuss here the development of 3D cell traction microscopy, its current limitations, and perspectives on the future of this technology. Emphasis is placed on strategies for applying 3D cell traction microscopy to individual tumor cell migration within collagen gels. - Highlights: Review of the current state of the art in 3D cell traction force microscopy. Bulk and micro-characterization of remodelable fibrous collagen gels. Strategies for performing 3D cell traction microscopy within collagen gels.

Hall, Matthew S. [Department of Biological and Environmental Engineering, Cornell University, Ithaca, NY 14853 (United States); Long, Rong [Department of Mechanical Engineering, University of Alberta, Edmonton, AB, Canada T6G 2G8 (Canada); Feng, Xinzeng [Department of Mechanical and Aerospace Engineering, Cornell University, Ithaca, NY 14853 (United States); Huang, YuLing [Department of Biological and Environmental Engineering, Cornell University, Ithaca, NY 14853 (United States); Hui, Chung-Yuen [Department of Mechanical and Aerospace Engineering, Cornell University, Ithaca, NY 14853 (United States); Wu, Mingming, E-mail: mw272@cornell.edu [Department of Biological and Environmental Engineering, Cornell University, Ithaca, NY 14853 (United States)

2013-10-01T23:59:59.000Z

335

Ultra-bright pulsed electron beam with low longitudinal emittance  

DOE Patents [OSTI]

A high-brightness pulsed electron source, which has the potential for many useful applications in electron microscopy, inverse photo-emission, low energy electron scattering experiments, and electron holography has been described. The source makes use of Cs atoms in an atomic beam. The source is cycled beginning with a laser pulse that excites a single Cs atom on average to a band of high-lying Rydberg nP states. The resulting valence electron Rydberg wave packet evolves in a nearly classical Kepler orbit. When the electron reaches apogee, an electric field pulse is applied that ionizes the atom and accelerates the electron away from its parent ion. The collection of electron wave packets thus generated in a series of cycles can occupy a phase volume near the quantum limit and it can possess very high brightness. Each wave packet can exhibit a considerable degree of coherence.

Zolotorev, Max (Oakland, CA)

2010-07-13T23:59:59.000Z

336

Final Report: Algorithms for Diffractive Microscopy  

SciTech Connect (OSTI)

The phenomenal coherence and brightness of x-ray free-electron laser light sources, such as the LCLS at SLAC, have the potential of revolutionizing the investigation of structure and dynamics in the nano-domain. However, this potential will go unrealized without a similar revolution in the way the data are analyzed. While it is true that the ambitious design parameters of the LCLS have been achieved, the prospects of realizing the most publicized goal of this instrument the imaging of individual bio-particles remains daunting. Even with 10{sup 12} photons per x-ray pulse, the feebleness of the scattering process represents a fundamental limit that no amount of engineering ingenuity can overcome. Large bio-molecules will scatter on the order of only 10{sup 3} photons per pulse into a detector with 106 pixels; the diffraction images will be virtually indistinguishable from noise. Averaging such noisy signals over many pulses is not possible because the particle orientation cannot be controlled. Each noisy laser snapshot is thus confounded by the unknown viewpoint of the particle. Given the heavy DOE investment in LCLS and the profound technical challenges facing single-particle imaging, the final two years of this project have concentrated on this effort. We are happy to report that we succeeded in developing an extremely efficient algorithm that can reconstruct the shapes of particles at even the extremes of noise expected in future LCLS experiments with single bio-particles. Since this is the most important outcome of this project, the major part of this report documents this accomplishment. The theoretical techniques that were developed for the single-particle imaging project have proved useful in other imaging problems that are described at the end of the report.

Elser, Veit

2010-10-08T23:59:59.000Z

337

The Fortieth Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......currently the most probable material to be used in future nuclear fusion reactors. Trapping of cathodi- cally charged tritium at...line. One may consider the impulse and step functions as an input to the Gaussian system function of a low pass filter, the......

The Fortieth Annual Meeting of the Japanese Society of Electron Microscopy

1984-01-01T23:59:59.000Z

338

The Thirty-seventh Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......embedding in epoxy resin (Quetol 651...Cytochemical demonstration of the activity...the control of ion permeability in...associated with the exchange of metabolites...irradiated by ion beam for several...up in SEM. In addition, we observed...mA-min or more of ion beam irradiation......

Morris J. KARNOVSKY

1981-01-01T23:59:59.000Z

339

Computational methods for constructing protein structure models from 3D electron microscopy maps  

E-Print Network [OSTI]

into a low-res- olution EM map. A list of available computational tools is also provided. ? 2013 Elsevier Inc, Purdue University, West Lafayette, IN 47907, USA b Department of Biological Sciences, College of Science, Purdue University, West Lafayette, IN 47907, USA c Markey Center for Structural Biology, College

Kihara, Daisuke

340

Electron Microscopy Characterization of Tc-Bearing Metallic Waste Forms- Final Report FY10  

SciTech Connect (OSTI)

The DOE Fuel Cycle Research & Development (FCR&D) Program is developing aqueous and electrochemical approaches to the processing of used nuclear fuel that will generate technetium-bearing waste streams. This final report presents Pacific Northwest National Laboratory (PNNL) research in FY10 to evaluate an iron-based alloy waste form for Tc that provides high waste loading within waste form processing limitations, meets waste form performance requirements for durability and the long-term retention of radionuclides and can be produced with consistent physical, chemical, and radiological properties that meet regulatory acceptance requirements for disposal.

Buck, Edgar C.; Neiner, Doinita

2010-09-30T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


341

TWENTIETH SCIENTIFIC MEETING OF THE JAPANESE SOCIETY OF ELECTRON-MICROSCOPY:  

Science Journals Connector (OSTI)

......amplitude contrast of heavy metal particles...kc/ sec.. A reactor is used for the...are cooled with water to avoid the thermal...obserbed in the more advanced cells. B-8...secreted materials. Heavy deposition of...sealed with boiling water or with steam...region of the water sealed coating......

Twentieth Scientific Meeting of the Japanese Society of Electron-Microscopy: Held at Tokushima University; May 16; 17; 1964

1964-01-01T23:59:59.000Z

342

Preparation of Combinatorial Arrays of Polymer Thin Films for Transmission Electron Microscopy Analysis  

Science Journals Connector (OSTI)

Overwijk, M. H. F., Vandenheuvel, F. C., and Bullelieuwma, C. W. T. J. Vac. ... Overwijk, M. H. F.; van den Heuvel, F. C.; Bulle-Lieuwma, C. W. T. ...

Kristen E. Roskov; Thomas H. Epps; III; Brian C. Berry; Steven D. Hudson; Mava S. Tureau; Michael J. Fasolka

2008-10-20T23:59:59.000Z

343

Reactive ion etching: Optimized diamond membrane fabrication for transmission electron microscopy  

E-Print Network [OSTI]

Commonly used preparation method for thin diamond membranes by focused ion beam (FIB) techniques results in surface damage. Here, the authors introduce an alternative method based on reactive ion etching (RIE). To compare ...

Li, Luozhou

344

A review of focused ion beam technology and its applications in transmission electron microscopy  

Science Journals Connector (OSTI)

......as the "trench" method. In a variation of this method, Overwijk et al. [15] proposed a novel scheme in 1993 for the preparation...15 Overwijk M H F, van den Heuvel F C, and Bulle-Lieuwma C W T (1993......

Masaaki Sugiyama; Genichi Sigesato

2004-10-01T23:59:59.000Z

345

Graphene-layered steps and their fields visualized by 4D electron microscopy  

Science Journals Connector (OSTI)

Graphene-layered steps and their fields visualized...Enhanced image contrast has been seen at graphene-layered steps a few nanometers in height...observed steps are formed by the edges of graphene strips lying on the surface of a graphene...

Sang Tae Park; Aycan Yurtsever; John Spencer Baskin; Ahmed H. Zewail

2013-01-01T23:59:59.000Z

346

Platelet Adhesion in Rabbit Arteries observed by Scanning and Transmission Electron Microscopy  

Science Journals Connector (OSTI)

... the endothelium is removed from the mid-abdominal aorta of a rabbit, by passing a roughened probe into the lumen, only single platelets or small platelet clumps adhere to the ...

B. L. SHEPPARD; J. E. FRENCH

1970-03-14T23:59:59.000Z

347

Magnetofossil spike during the Paleocene-Eocene thermal maximum: Ferromagnetic resonance, rock magnetic, and electron microscopy  

E-Print Network [OSTI]

Magnetofossil spike during the Paleocene-Eocene thermal maximum: Ferromagnetic resonance, rock,2 Timothy D. Raub,3,4 Dirk Schumann,5 Hojatollah Vali,5 Alexei V. Smirnov,3,6 and Joseph L. Kirschvink1 controversial hypothesis that a cometary impact triggered the PETM. Here we present ferromagnetic resonance (FMR

348

THE TWENTY-FIFTH SYMPOSIUM OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......for almost all elements from hydrogen to uranium. Quantitative analyses by IMA have been...Kazuhiko R. UTSUMI Lab. Cell Biol., Aichi Cancer Cent., Res. fnsl., Nagoya, 464 After...chromatin fibrils were obvious. Histone-depleted chromatin was also prepared to examine......

The Twenty-fifth Symposium of the Japanese Society of Electron Microscopy

1980-01-01T23:59:59.000Z

349

Four-Wave Mixing Microscopy with Electronic Contrast of Individual Carbon Nanotubes  

E-Print Network [OSTI]

and J. Jiang, in Carbon Nanotubes, edited by A. Jorio, G.V. Perebeinos, in Carbon Nanotubes, edited by A. Jorio, G.and P. Finnie, in Carbon Nanotubes, edited by A. Jorio, G.

Collins, Philip G

2012-01-01T23:59:59.000Z

350

The Thirty-seventh Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......pump (SIP) after being rough pumped by a turbo molecular pump...fol- lowing features; 1) storage of the present observation...La(NO,)8] using the seawater adapted eel (Anguilla japonica...each other in the phase of storage. Inclusion bodies which are......

Morris J. KARNOVSKY

1981-01-01T23:59:59.000Z

351

SCANNING ELECTRON MICROSCOPY AND PORE CASTING: CHEROKEE AND BUG FIELDS, SAN JUAN COUNTY, UTAH  

SciTech Connect (OSTI)

Over 400 million barrels (64 million m{sup 3}) of oil have been produced from the shallow-shelf carbonate reservoirs in the Pennsylvanian (Desmoinesian) Paradox Formation in the Paradox Basin, Utah and Colorado. With the exception of the giant Greater Aneth field, the other 100 plus oil fields in the basin typically contain 2 to 10 million barrels (0.3-1.6 million m{sup 3}) of original oil in place. Most of these fields are characterized by high initial production rates followed by a very short productive life (primary), and hence premature abandonment. Only 15 to 25 percent of the original oil in place is recoverable during primary production from conventional vertical wells. An extensive and successful horizontal drilling program has been conducted in the giant Greater Aneth field. However, to date, only two horizontal wells have been drilled in small Ismay and Desert Creek fields. The results from these wells were disappointing due to poor understanding of the carbonate facies and diagenetic fabrics that create reservoir heterogeneity. These small fields, and similar fields in the basin, are at high risk of premature abandonment. At least 200 million barrels (31.8 million m{sup 3}) of oil will be left behind in these small fields because current development practices leave compartments of the heterogeneous reservoirs undrained. Through proper geological evaluation of the reservoirs, production may be increased by 20 to 50 percent through the drilling of low-cost single or multilateral horizontal legs from existing vertical development wells. In addition, horizontal drilling from existing wells minimizes surface disturbances and costs for field development, particularly in the environmentally sensitive areas of southeastern Utah and southwestern Colorado.

Thomas C. Chidsey Jr; David E. Eby; Louis H. Taylor

2003-12-01T23:59:59.000Z

352

The Thirty-fifth Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......from 421 samples of soil, mud, water, solar salt, raw and processed fish and algae...capacitance between the large area common collector region of the memory array and surroundings...Distributions of these two types of cells in horizontal sections of anterior pituitaries were......

The Thirty-fifth Annual Meeting of the Japanese Society of Electron Microscopy

1979-01-01T23:59:59.000Z

353

Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems  

Science Journals Connector (OSTI)

...in solving the pressing energy problems facing us today...Discussion Meeting Issue New possibilities with aberration-corrected...Wang), pp.152-191. New York, NY: Springer. Pennycook...and analysis to solving energy problems. | The new possibilities of aberration-corrected...

2009-01-01T23:59:59.000Z

354

Electron Microscopy Catalysis Projects: Success Stories from the High Temperature Materials Laboratory (HTML) User Program  

Broader source: Energy.gov [DOE]

2009 DOE Hydrogen Program and Vehicle Technologies Program Annual Merit Review and Peer Evaluation Meeting, May 18-22, 2009 -- Washington D.C.

355

A technique for quantitative and qualitative viewing of aquatic bacteria using scanning electron microscopy  

E-Print Network [OSTI]

microscopic enumeration techniques. Water samples are concentrated on pre-wetted (Triton X-100) Nuclepore filters (0. 2 um pore size) to prov1de a uniform distri- bution of bacteria on the filter surface and vacuum filtered (660 Torr). The filter... is transferred to a petri dish containing filter paper soaked 1n 2% glutaraldehyde and the bacter1a are fixed for one hour. Dehydration 1s performed by transferr1ng the filters through a series of petri dishes conta1ning filter paper saturated with 25, 50, 75...

Dreier, Thomas Michael

2012-06-07T23:59:59.000Z

356

THE FORTY-FIRST ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......levels of all animals were measured by a Corn- ing calcium analyzer. The mean number...were cut mechanically and thinned by ion milling for observa- tion along the a-axis...material of f-alumina is produced by wet methods from hydroxide, and studied mainly......

The Forty-first Annual Meeting of the Japanese Society of Electron Microscopy

1985-01-01T23:59:59.000Z

357

NINETEENTH SCIENTIFIC MEETING OF THE SOCIETY OF ELECTRON-MICROSCOPY, JAPAN:  

Science Journals Connector (OSTI)

......WATANABE and T. ETO Japan Electric Optics Laboratory...YANAKA and K. ETO Japan Electric Optics Laboratory...40 MC high frequency discharge adopted as an ion source...micro-recording, a hot cathod arc discharge ion source is so de......

Nineteenth Scientific Meeting of the Society of Electron-Microscopy; Japan: Held at Hiroshima University; May 18; 19; 1963

1963-01-01T23:59:59.000Z

358

THE THIRTY-THIRD ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......linear beam profiles arc demon- strated. 12-AIII-3...aberrations of the combined electric and magnetic field...without causing micro-discharge. In addition, the...by a direct flow of electric current. The temperature...mechanism in A.C. glow discharge system, which is often......

The Thirty-third Annual Meeting of the Japanese Society of Electron Microscopy

1977-01-01T23:59:59.000Z

359

A review of focused ion beam technology and its applications in transmission electron microscopy  

Science Journals Connector (OSTI)

......fabrication technologies. Damage issues...twodimensional,cell-basedtopographysimulations...of polymer solar cells deposited on...progress of FIB technology and its applications...observation technology of binder...of polymer solar cells deposited on......

Masaaki Sugiyama; Genichi Sigesato

2004-10-01T23:59:59.000Z

360

In Situ Transmission Electron Microscopy Study of Electrochemical Sodiation and Potassiation of Carbon Nanofibers  

E-Print Network [OSTI]

to store large amounts of electrical energy from intermittent renewable sources such as solar and wind Mexico 87185, United States Department of Mechanical Engineering, University of Maryland, College Park The large-scale storage of electrical energy for applications in electrical grids requires battery systems

Zhu, Ting

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


361

The Forty-fourth Amual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......photoreceptor membrane proteins are severely defective. 2-11-15. Fine structure of the compound...that the outer and middle layers differ in car- bohydrate composition. The binding sites...isoenzyme pattern. The weight of this car- diomyopathic hamster is 150gm. In 20......

The Forty-fourth Amual Meeting of the Japanese Society of Electron Microscopy

1988-10-01T23:59:59.000Z

362

THE TWENTY-SECOND SCIENTIFIC MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......Saccharomyces cerevisiae was compared with a strain defective in p. Aerobically grown mutant cells contain...Particles in RF Mouse Leukemia Induced by Car- cinogens and Other Means Z. OTA, H...Final-thinning: The electropolishinfr is car- ried out uniform polishing in the center......

The Twenty-second Scientific Meeting of the Japanese Society of Electron Microscopy

1966-01-01T23:59:59.000Z

363

THE FORTY-FIRST ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......000 kV DF is superior to BF up to Ael for gold as well as for car- bon. Despite the larger effect, DF mode at 1,000 kV is...shift in the [TTT] direction. 232 41st Annual Meeting The defective image in the specimen, thinned parallel to the (001) plane......

The Forty-first Annual Meeting of the Japanese Society of Electron Microscopy

1985-01-01T23:59:59.000Z

364

THE THIRTY-NINTH ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......techniques are required for the conventional stigmation which is car- ried out by observing details of the image. 31-A-III-9...the differentiation of NAO during meiosis II, which might be defective in most of the spo mutants. 31-B-IV-22. Ultrastructural......

The Thirty-ninth Annual Meeting of the Japanese Society of Electron Microscopy

1983-01-01T23:59:59.000Z

365

The Forty-fourth Amual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......by a pyrolytic process of engine oil. 2. Soot in the exhaust...incomplete combustion of fuel. Particle size is inversely proportional to engine speed. 3. Graphitized carbon...and higher liquid helium consumption rate of this holder (150cc......

The Forty-fourth Amual Meeting of the Japanese Society of Electron Microscopy

1988-10-01T23:59:59.000Z

366

THE THIRTY-FOURTH ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......gun with laser-heated cathode Y. UCHIKAWA, K. OZAKI...absorption by possible cathode materials, 2) output instability...Tokyo Anti-static materials used in our experiments are surface-active agents of which main properties......

The Thirty-fourth Annual Meeting of the Japanese Society of Electron Microscopy

1978-01-01T23:59:59.000Z

367

The Thirty-fourth Symposium of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......Inorganic and organic materials were discussed in comparison...diamond among Inorganic materials, and applications to...action product at the active site without post osmification...proved, the role of active oxygen was not proved...are observed on the cathode ray tube of the SEM......

Kei-Ichi HIRAJ

1990-06-01T23:59:59.000Z

368

Morphological expressions of antibiotic synergism against Pseudomonas aeruginosa as observed by scanning electron microscopy.  

Science Journals Connector (OSTI)

...spheroplasts; (v) surface holes or pits; (vi) super-elongation...spheroplasts; (v) surface holes or pits; (vi) super-elongation...spheroplasts; (v) surface holes or pits; (vi) super-elongation...isolated from a patient with severe burns. The susceptibility of the...

S J Waisbren; D J Hurley; B A Waisbren

1980-12-01T23:59:59.000Z

369

Development of a large format direct detection device for three dimensional transmission electron microscopy  

E-Print Network [OSTI]

F. Duttweiler, J.C. Bouwer, S.T. Peltier, M.H. Ellisman, andDuttweiler, J.C. Bouwer, S.T. Peltier, M. Ellisman, and N.H.Duttweiler, J.C. Bouwer, S.T. Peltier, A.C. Milazzo, and M.

Milazzo, Anna-Clare

2009-01-01T23:59:59.000Z

370

THE THIRTY-FIRST ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......cryo-ultramicrotomy. The rubber-components of them were ethylene-propylene rubber, chlorinated polyethy- lene rubber and...as usual specimen holder. 3) low cost: about ten percent price of usual STEM method. D-18. Characteristics of photographic......

The Thirty-first Annual Meeting of the Japanese Society of Electron Microscopy

1975-01-01T23:59:59.000Z

371

THE TWENTY-FOURTH SCIENTIFIC MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......CMB was PAS positive, stainable with Sudan black B or Nile blue A, extracted by...fisheyes pupil the striations re- lated to thermal etching were observed. C-HI-11...R(formvar), which suggest that thermal conductivity plays an important roll......

The Twenty-fourth Scientific Meeting of the Japanese Society of Electron Microscopy

1968-01-01T23:59:59.000Z

372

The Forty-sixth Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......Host of a l l environmental gas, water vapor,air,O ,He and etc.can be used for amplification...an ion gun, evaporators and a gas inlet instrument. The UHV...chemical reactions among gases, liquids and solids, irradiation effects......

Harunori ISHIKAWA

1990-08-01T23:59:59.000Z

373

THE THIRTY-NINTH ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......lattice fringe of (002) and the brighter fringe in every...in every six BaO3 layers and resulted Mn ions with lower...HIRABAYASHI, Shinsuke HAYASHI and Toshio HIRAI Res. Inst...materials for high temperature gas turbines. However, hot-pressed......

The Thirty-ninth Annual Meeting of the Japanese Society of Electron Microscopy

1983-01-01T23:59:59.000Z

374

Scanning Electron Microscopy of Squid, Loligo peale;: Raw, Cooked, and Frozen Mantle  

E-Print Network [OSTI]

OTWELL and GEORGE G. GIDDINGS W. Steven Otwell is with the Department of Food Science and Human Nutrition, University of Florida, Gainesville, FL 32611. George G. Gid- dings is with the Fundacion Chile, Avda Santa, but cooking caused gross distortions in all mantle tissues. North Carolina, and cleaned for use (skin, head

375

Investigating the Optical Properties of Dislocations by Scanning Transmission Electron Microscopy  

E-Print Network [OSTI]

investigation for solid-state lighting and display applications, and dislocations are known to be nonradiative the radiative pathway and contribute to the enormous savings in energy use and greenhouse gas emissions expected with efficient solid-state lighting. CL Studies of Dislocations One of the key advantages of a scanning micro

Pennycook, Steve

376

Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems  

Science Journals Connector (OSTI)

...fuels, but the conversion efficiency of...into electrical energy is limited by...functionality in energy conversion devices such as...insights into the carrier dynamics in the...ability to study energy conversion processes in materials...

2009-01-01T23:59:59.000Z

377

ABSTRACTS FROM THE KYUSHU REGIONAL SCIENTIFIC MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......Dubin-Johnson Syndrome and Gilbert's Disease K. TANIKAWA Second...Dubin-Johnson syndrome and two with Gilbert's disease, were observed...more or less altered. In Gilbert's disease, the flattening...and Z. YOSHII Department of Microbiology, School of Medicine, Yamaguchi......

Abstracts from the Kyushu Regional Scientific Meeting of the Japanese Society of Electron Microscopy

1966-01-01T23:59:59.000Z

378

THE TWENTY-THIRD SCIENTIFIC MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......Particles M. NAKAI and T. NAITO Dept. of Microbiology and Central Laboratory Osaka Medical...Pasteurella Tularensis M. FUJISAWA Dept. of Microbiology, Osaka Medical College, Osaka Cultures...Disse space and changes of ER seen in Gilbert's disease may provide morpho- logical......

The Twenty-third Scientific Meeting of the Japanese Society of Electron Microscopy

1967-01-01T23:59:59.000Z

379

Automation for on-line remote-control in-situ electron microscopy  

E-Print Network [OSTI]

Pfefferkorn Conference (1996) Automation for On-Line Remote-Pfefferkorn Conference (1996) Automation for On-Line Remote-by incorporating local automation of stage control and

1996-01-01T23:59:59.000Z

380

THE TWENTY-EIGHTH ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......strongly expressing the synthesis of collagen fibers...stained with uranyl acetate solution followed by...chloride or 1% uranyl acetate as the postfixative...microscope SSM-2 and a lithium-drifted Si de- tector...stain- ing with uranyl acetate and lead followed by......

The Twenty-Eighth Annual Meeting of the Japanese Society of Electron Microscopy

1972-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


381

Measuring Localized Redox Enzyme Electron Transfer in a Live Cell with Conducting Atomic Force Microscopy  

Science Journals Connector (OSTI)

Department of Bioengineering, ?Department of Aerospace and Mechanical Engineering, ?Materials Science Program, University of California San Diego, 9500 Gillman Dr., La Jolla, California 92093, United States ... Connelly, L.; Meckes, B.; Larkin, J.; Gillman, A. L.; Wanunu, M.; Lal, R. ACS Appl. ... Connelly, Laura S.; Meckes, Brian; Larkin, Joseph; Gillman, Alan L.; Wanunu, Meni; Lal, Ratnesh ...

Lital Alfonta; Brian Meckes; Liron Amir; Orr Schlesinger; Srinivasan Ramachandran; Ratnesh Lal

2014-06-30T23:59:59.000Z

382

Validation of Pisum sativum agglutinin fluorescent marker for stallion spermatozoal acrosomes with transmission electron microscopy  

E-Print Network [OSTI]

. Either 1 uM or 10 uM A23187 (a calcium ionophore) was added to each ejaculate and incubated for 1,2 and 3 hours at two different temperatures (37C? and 22C?). Raw semen or extender were fixed at time zero to serve as baseline controls. Other untreated...

Carrell, Betty Pauline

2012-06-07T23:59:59.000Z

383

Study of perineal patterns of four species of Meloidogyne (Nematoda:Heteroderoidea) using scanning electron microscopy  

E-Print Network [OSTI]

Strawberry ~tco ersico culent m Arachis ~ho ea Citrull ~ s )rraris ~tco e sico escule t ~ca sicum fr tescens Arachis ~ho ea ~fa a ia sp. Rutgers Florunner Charleston Gray Rutgers California Wonder Florunner Albritton M. ~ico ~ ta M. java' ice... 75-8 (Race 1) 75-30 (Race 3) 75-30 75-37 73-57 74-19 75-37 75-32 75-2 Tomato Tomato Sweet potato Watermelon Corn Pepper Cotton Tomato Watermelon ~tco ersicon esc lentum ~to ersico esculentum ~iomoea batatas C t ullus ~ul s Zea...

Khan, Zainab Najafali

2012-06-07T23:59:59.000Z

384

Optimizing the environment for sub-0.2 nm scanning transmission electron microscopy  

Science Journals Connector (OSTI)

......where the manufacturer's specifications will be most complete) are...or neoprene greatly damps thermal fluctuations (Fig. 7...with neoprene for improved thermal stability. D. A. Muller...column helps greatly, better insulation of the stage drives and objective......

A Muller; J Grazul

2001-05-01T23:59:59.000Z

385

Developing a denoising filter for electron microscopy and tomography data in the cloud  

E-Print Network [OSTI]

of Pediatric Radiology, Texas Children's Hospital, 6621 Fannin St., Houston, TX 77030, USA Present Address: M

Wriggers, Willy

386

Transmission electron microscopy of synthetic and natural Fnferketten and Siebenerketten pyroxenoids  

Science Journals Connector (OSTI)

A new type of fault, called a chain periodicity fault, has been observed in Fnferketten and Siebenerketten pyroxenoids. The faults are mainly parallel to (001) and are due to irregularities in the periodicity...

H. Ried; M. Korekawa

1980-04-01T23:59:59.000Z

387

The Thirty-seventh Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......In addition, the number of storage granules and hetcrogeneously...fol- lowing features; 1) storage of the present observation...La(NO,)8] using the seawater adapted eel (Anguilla japonica...each other in the phase of storage. Inclusion bodies which are......

Morris J. KARNOVSKY

1981-01-01T23:59:59.000Z

388

TRANSMISSION ELECTRON MICROSCOPY AND RUTHERFORD BACKSCATTERING STUDIES OF DIFFERENT DAMAGE STRUCTURES IN p+ IMPLANTED Si  

E-Print Network [OSTI]

Peregainus, Stevenage) )970 and AERE Report R 6496 (1970).Jim Stephens and D. Chivers of AERE Harewell (England) for

Sadana, D.K.

2013-01-01T23:59:59.000Z

389

Transmission electron microscopy studies of GaN/gamma-LiAlO 2 heterostructures.  

E-Print Network [OSTI]

??Die vorliegende Arbeit beschaeftigt sich mit dem strukturellen Aufbau von (1-100) M-plane GaN, das mit plasmaunterstuetzter Molekularstrahlepitaxie auf gamma-LiAlO2(100) Substraten gewachsen wurde. Die heteroepitaktische Ausrichtung (more)

Liu, Tian-Yu

2005-01-01T23:59:59.000Z

390

Assembly of Large Three-Dimensional Volumes from Serial-Section Transmission Electron Microscopy  

E-Print Network [OSTI]

Pavel Koshevoy1, Tolga Tasdizen1, Ross Whitaker1, Bryan Jones2 and Robert Marc2 1Scientific Computing size and limited field of view: each section must be assembled from many overlapping tiles, a process, data-driven descriptions of microscopic structures are very important in neurobiology. While neural

Utah, University of

391

A review of focused ion beam technology and its applications in transmission electron microscopy  

Science Journals Connector (OSTI)

......Observation of the configuration of binder latex in coating layer -Direct observation technology of binder. In: Proc. Japan TAPPI Annual Meeting, pp. 679-685....................

Masaaki Sugiyama; Genichi Sigesato

2004-10-01T23:59:59.000Z

392

A review of focused ion beam technology and its applications in transmission electron microscopy  

Science Journals Connector (OSTI)

......a technique that requires high electric fields (10 6 V/cm) to be applied...and metal at the same time. In automobile tyres, a steel cord is plated with...effects of implanted Ga on high electric field diamond devices fabricated......

Masaaki Sugiyama; Genichi Sigesato

2004-10-01T23:59:59.000Z

393

THE THIRTY-NINTH ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......a practical condition. The electro-resistance and mass-thickness were simul- taneously...showed the lower levels of surface electric charge and membrane sialic acid of erythrocytes...plasmolysis occurred somewhat in both cells, elementary bodies and reticulate forms. 2-B-II-ll......

The Thirty-ninth Annual Meeting of the Japanese Society of Electron Microscopy

1983-01-01T23:59:59.000Z

394

THE TWENTY-EIGHTH ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......Univ., Kyoto When purified elementary bodies (EB) of C. psittaci...donors, a tetra- cycline resistance transduction study was con...revealed that both could transfer resistance. Another noteworthy finding...materials were investigated. An electric conductive Au coated polyester......

The Twenty-Eighth Annual Meeting of the Japanese Society of Electron Microscopy

1972-01-01T23:59:59.000Z

395

The Fortieth Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......abnormally near the nuclear membrane, or...generator and an accelerator are housed in...stages of the accelerator and to obtain an ultra high dry vacuum (~ 10~B Pa...a six-stage accelerator. The gun vacuum is 10"" Pa and......

The Fortieth Annual Meeting of the Japanese Society of Electron Microscopy

1984-01-01T23:59:59.000Z

396

Structural defects in GaN revealed by Transmission Electron Microscopy  

E-Print Network [OSTI]

67, 410 (1985). 23) M. Tachikawa and M Yamaguchi, Appl.Fig. 2. 20) However, Tachikawa and Yamaguchi model adapted

Liliental-Weber, Zuzanna

2014-01-01T23:59:59.000Z

397

The Forty-fourth Amual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......in the corresponding cells of the dry type. Light granules were abundant in...granules were rare in these cells in the dry-type gland. Furthermore, the light granules...it is not clearly evident in the dry-type gland. These differences may be......

The Forty-fourth Amual Meeting of the Japanese Society of Electron Microscopy

1988-10-01T23:59:59.000Z

398

Isolation methods and electron microscopy of the Internal Cork Virus of sweet potatoes  

E-Print Network [OSTI]

of the Virus Within the Cells of a Lesion from a Tuber 2 20 A lesion from a tuber was cut into cubes about one-half millimeter on an edge. Half of the cubes were fixed in buffered osmic acid and the other half were fixed in potassium permanganate solution... of the Virus Within the Cells of a Lesion from a Tuber 2 20 A lesion from a tuber was cut into cubes about one-half millimeter on an edge. Half of the cubes were fixed in buffered osmic acid and the other half were fixed in potassium permanganate solution...

Pickens, Edgar Eugene

2012-06-07T23:59:59.000Z

399

An electron microscopy study of ground-nut poisoning in turkey poults  

E-Print Network [OSTI]

condition. Similar toxic effects in ducklings, chickens, rats, guinea pigs, cows and pigs have also been reported. In general, there is little available information about how and where tbe toxic principles of any kind act in the cells structures. Also... an interpretation of the most significant ultrastructure changes, which sre found in liver cells 1n experimental poults on tox1c Brasilian ground-nut meal, and to correlate the observed change in ultrastructura with the ultrastructure of normal poults anc ~1th...

Martin, Alcides Amilcar

2012-06-07T23:59:59.000Z

400

THE THIRTY-NINTH ANNUAL MEETING OF THE JAPANESE SOCIETY OF ELECTRON MICROSCOPY:  

Science Journals Connector (OSTI)

......high temperature gas turbines. However, hot-pressed...sorts of monomer gas. In parallel with...example: replication technology for chemically treated...second the mixed gas of N2(92%) and...trebled. PD-15. Development of a damageless ion......

The Thirty-ninth Annual Meeting of the Japanese Society of Electron Microscopy

1983-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


401

Atomic Force Microscopy and Kelvin Probe Force Microscopy Evidence of Local Structural Inhomogeneity and Nonuniform Dopant Distribution in Conducting Polybithiophene  

Science Journals Connector (OSTI)

Atomic Force Microscopy and Kelvin Probe Force Microscopy Evidence of Local Structural Inhomogeneity and Nonuniform Dopant Distribution in Conducting Polybithiophene ... The fundamental difference between polymer grains and grain peripheral areas demonstrated by KFM was also supported by in situ contact-mode AFM data taken with the as-grown polymer film. ... (1)?Pekker, S.; Janossy, A. In Handbook of Conducting Polymers; Skotheim, T. A., Ed.; Marcel Dekker:? New York, 1986; Vol. ...

Oleg A. Semenikhin; Lei Jiang; Tomokazu Iyoda; Kazuhito Hashimoto; Akira Fujishima

1996-11-28T23:59:59.000Z

402

E-Print Network 3.0 - advanced microscopy techniques Sample Search...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

microscopy techniques and their practice in relationship to materials structure characterization... of Microscopy", Edited by P.W. Hawkes and J.C.H. Spence, Springer, 2006 (An...

403

Soft X-Ray Microscopy and Spectroscopy at the Molecular Environmental...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Soft X-Ray Microscopy and Spectroscopy at the Molecular Environmental Science Beamline at the Advanced Light Source. Soft X-Ray Microscopy and Spectroscopy at the Molecular...

404

Three-dimensional reconstruction of the -AlCrFe phase by electron crystallography  

Science Journals Connector (OSTI)

The three-dimensional structure of the huge quasicrystal approximant -AlFeCr was solved by electron crystallography, using high-resolution transmission-electron-microscopy (HREM) images and selected-area electron diffraction patterns from 13 different zone axes. This is the first example of an inorganic structure with over 100 unique atoms being solved to atomic resolution by electron crystallography.

Zou, X.D.

2003-10-28T23:59:59.000Z

405

Determination of the positions and orientations of concentrated rod-like colloids from 3D microscopy data  

E-Print Network [OSTI]

Confocal microscopy in combination with real-space particle tracking has proven to be a powerful tool in scientific fields such as soft matter physics, materials science and cell biology. However, 3D tracking of anisotropic particles in concentrated phases remains not as optimized compared to algorithms for spherical particles. To address this problem, we developed a new particle-fitting algorithm that can extract the positions and orientations of fluorescent rod-like particles from three dimensional confocal microscopy data stacks, even when the fluorescent signals of the particles overlap considerably. We demonstrate that our algorithm correctly identifies all five coordinates of uniaxial particles in both a concentrated disordered phase and a liquid-crystalline smectic-B phase. Apart from confocal microscopy images, we also demonstrate that the algorithm can be used to identify nanorods in 3D electron tomography reconstructions. Lastly, we determined the accuracy of the algorithm using both simulated and experimental confocal microscopy data-stacks of diffusing silica rods in a dilute suspension. This novel particle-fitting algorithm allows for the study of structure and dynamics in both dilute and dense liquid-crystalline phases (such as nematic, smectic and crystalline phases) as well as the study of the glass transition of rod-like particles in three dimensions on the single particle level.

T. H. Besseling; M. Hermes; A. Kuijk; B. de Nijs; T. -S. Deng; M. Dijkstra; A. Imhof; A. van Blaaderen

2014-06-19T23:59:59.000Z

406

Electron CoolingElectron Cooling Sergei Nagaitsev  

E-Print Network [OSTI]

Electron CoolingElectron Cooling Sergei Nagaitsev FNAL - AD April 28, 2005 #12;Electron Cooling methods must "get around the theorem" e.g. by pushing phase-space around. #12;Electron Cooling - Nagaitsev 3 TodayToday''s Menus Menu What is cooling? Types of beam cooling Electron cooling Conclusions #12

Fermilab

407

Single-molecule electron transfer reactions in nanomaterials  

SciTech Connect (OSTI)

Here we report the study of single molecule electron transfer dynamics by coupling fluorescence microscopy at a conventional electrochemical cell. The single-molecule fluorescence spectroelectrochemistry of cresyl violet in aqueous solution and on nanoparticle surface were studied. We observed that the single-molecule fluorescence intensity of cresyl violet is modulated synchronously with the cyclic voltammetric potential scanning. We attribute the fluorescence intensity change of single cresyl violet molecules to the electron transfer reaction driven by the electrochemical potential.

Hu, Dehong; Lei, Chenghong; Ackerman, Eric J.

2009-07-26T23:59:59.000Z

408

Reducing Photobleaching in STED Microscopy with Higher Scanning Speed  

E-Print Network [OSTI]

Photobleaching is a major limitation of super-resolution STED microscopy. We show that the photobleaching rate in STED microscopy is slowed down by scanning with a higher linear speed, enabled by the large field of view in our custom-built resonant-scanning STED microscope. The effect of scanning speed on photobleaching is more remarkable at higher levels of depletion laser irradiance. With a depletion irradiance of 0.4 GW/cm$^2$ (time average), we were able to slow down the photobleaching of the Atto 647N dye by 80% with 8-fold faster scanning. Photobleaching is primarily caused by the depletion light acting upon the excited fluorophores. Experimental data qualitatively agree with a theoretical model. Our results encourage further increasing linear scanning speed for photobleaching reduction in STED microscopy.

Wu, Yong

2014-01-01T23:59:59.000Z

409

Single Atom Electron and Ion Sources and Their Applications  

E-Print Network [OSTI]

- energy electron point projection microscope, PPM) (37, 38) 1. (shadow microscopy) (shadow image-walled carbon nanotubes, SWNTs) (111) (pizeo-scanner) X- Y-Z (scanning tunneling microscope) 3. (a on the screen (mm) Intensity(Arb.Units) (c) (a) (b) Q FWHM P (a) (b)Dd sample holder detector-MCP #12;13 98

410

SHORT REPORT Open Access Nuclear lipid droplets identified by electron  

E-Print Network [OSTI]

SHORT REPORT Open Access Nuclear lipid droplets identified by electron microscopy of serial that nuclear lipid droplets (LDs) are organized into domains similar to those of cytoplasmic LDs with the nuclear envelope, it could be suggested however that nuclear LDs are cytoplamic LDs trapped within

Boyer, Edmond

411

Generative Models for Super-Resolution Single Molecule Microscopy Images of Biological Structures  

E-Print Network [OSTI]

an information bridge between super-resolution microscopy and structural biology by using generative models

Matsuda, Noboru

412

Atom probe field ion microscopy and related topics: A bibliography 1992  

SciTech Connect (OSTI)

This bibliography contains citations of books, conference proceedings, journals, and patents published in 1992 on the following types of microscopy: atom probe field ion microscopy (108 items); field emission microscopy (101 items); and field ion microscopy (48 items). An addendum of 34 items missed in previous bibliographies is included.

Russell, K.F.; Godfrey, R.D.; Miller, M.K.

1993-12-01T23:59:59.000Z

413

Transmission Electron Microscope and Scanning Electron Microscopes -  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Facilities > Transmission Electron Facilities > Transmission Electron Microscope and Scanning Electron Microscopes FACILITIES Transmission Electron Microscope and Scanning Electron Microscopes Overview Other Facilities Work with Argonne Contact us For Employees Site Map Help Join us on Facebook Follow us on Twitter NE on Flickr Transmission Electron Microscope and Scanning Electron Microscopes The research activities of the Corrosion and Mechanics of Materials Section are supported by complete metallography/sample preparation rooms equipped with several optical and electron microscopes: a Transmission Electron Microscope and two Scanning Electron Microscopes. Bookmark and Share Transmission electron microscope (TEM) Detail of JEOL 100CXII TEM Figure 1: Detail of JEOL 100CXII TEM. Click on image to view larger image.

414

Ecological and agricultural applications of synchrotron IR microscopy  

E-Print Network [OSTI]

Ecological and agricultural applications of synchrotron IR microscopy T.K. Raab a,*, J.P. Vogel b factors to the fungus Erysiphe cichoracearum, a causative agent of powdery mildew disease. Three genes to pro- liferate when environmental conditions and re- sources are optimum. Cellulose, an abundant

415

Nanoscale Thermotropic Phase Transitions Enhance Photothermal Microscopy Signals  

E-Print Network [OSTI]

the material undergoes a phase transition. Herein, we show that thermotropic phase transitions in 4-Cyano-41 Nanoscale Thermotropic Phase Transitions Enhance Photothermal Microscopy Signals A. Nicholas G-objects in various environments. It uses a photo-induced change in the refractive index of the environment. Taking

Boyer, Edmond

416

Sample heating in near-field scanning optical microscopy  

E-Print Network [OSTI]

Heating near the aperture of aluminumcoated,fiber opticnear-field scanning optical microscopy probes was studied as a function of input and output powers. Using the shear-force feedback method, near-field probes were positioned nanometers above a...

Erickson, Elizabeth S.; Dunn, Robert C.

2005-10-05T23:59:59.000Z

417

Nanometric depth resolution from multi-focal images in microscopy  

Science Journals Connector (OSTI)

...that have been stored in a computer, but it is noted that using...interdisciplinary Bridging the Gaps grant from the UK Engineering and...Physics, SUPA/IIS, School of Engineering and Physical...instrumentation Image Processing, Computer-Assisted methods Microscopy...

2011-01-01T23:59:59.000Z

418

Image processing pipeline for synchrotron-radiation-based tomographic microscopy  

Science Journals Connector (OSTI)

A software environment has been developed for processing and reconstructing online the large amount of data generated at TOMCAT, a synchrotron-radiation-based tomographic microscopy beamline of the Swiss Light Source at Paul Scherrer Institute, Switzerland. It has been designed to minimize user interaction and maximize the reconstruction speed and therefore optimize beam time usage.

Hintermller, C.

2010-05-14T23:59:59.000Z

419

Detection of protein conformation defects from fluorescence microscopy images  

Science Journals Connector (OSTI)

A diagnostic method for protein conformational diseases (PCD) from microscopy images is proposed when such conformational conflicts involve muscular intranuclear inclusions (INIs) indicative of oculopharyngeal muscular dystrophy (OPMD), one variety of ... Keywords: Computer-aided diagnosis, Histogram, Microscopic images, Pattern classification, Protein conformational diseases, Texture analysis

Peifang Guo; Prabir Bhattacharya

2013-09-01T23:59:59.000Z

420

Laser scanning third-harmonic-generation microscopy in biology  

E-Print Network [OSTI]

. Denk, J. H. Stricker and W. W. Webb, "Two-photon laser scanning fluorescence microscopy," Science 248, 73-76 (1990). 3. S. Maiti, J. B. Shear, R. M. Williams, W. R. Zipfel and W. W. Webb, "Measuring-214 (1996). 6. R. Hellwarth and P. Christensen, "Nonlinear optical microscopic examination of structure

Silberberg, Yaron

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


421

In-situ and ex-situ observations of lithium de-intercalation from LiCoO? : atomic force microscopy and transmission electron microscopy studies  

E-Print Network [OSTI]

Lithium cobalt dioxide is the most commonly used material for positive electrodes in lithium rechargeable batteries. During lithium de-intercalation from this material, ... undergoes a number of phase transitions, which ...

Clmenon, Anne

2005-01-01T23:59:59.000Z

422

Optically pulsed electron accelerator  

DOE Patents [OSTI]

An optically pulsed electron accelerator can be used as an injector for a free electron laser and comprises a pulsed light source, such as a laser, for providing discrete incident light pulses. A photoemissive electron source emits electron bursts having the same duration as the incident light pulses when impinged upon by same. The photoemissive electron source is located on an inside wall of a radiofrequency-powered accelerator cell which accelerates the electron burst emitted by the photoemissive electron source.

Fraser, J.S.; Sheffield, R.L.

1985-05-20T23:59:59.000Z

423

Optically pulsed electron accelerator  

DOE Patents [OSTI]

An optically pulsed electron accelerator can be used as an injector for a free electron laser and comprises a pulsed light source, such as a laser, for providing discrete incident light pulses. A photoemissive electron source emits electron bursts having the same duration as the incident light pulses when impinged upon by same. The photoemissive electron source is located on an inside wall of a radio frequency powered accelerator cell which accelerates the electron burst emitted by the photoemissive electron source.

Fraser, John S. (Los Alamos, NM); Sheffield, Richard L. (Los Alamos, NM)

1987-01-01T23:59:59.000Z

424

Instrument Series: Microscopy Aberration-Corrected Scanning/Transmission  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Aberration-Corrected Aberration-Corrected Scanning/Transmission Electron Microscope EMSL's aberration-corrected Titan 80-300(tm) scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials. Research Applications

425

Electronic transport in graphene-based heterostructures  

SciTech Connect (OSTI)

While boron nitride (BN) substrates have been utilized to achieve high electronic mobilities in graphene field effect transistors, it is unclear how other layered two dimensional (2D) crystals influence the electronic performance of graphene. In this Letter, we study the surface morphology of 2D BN, gallium selenide (GaSe), and transition metal dichalcogenides (tungsten disulfide (WS{sub 2}) and molybdenum disulfide (MoS{sub 2})) crystals and their influence on graphene's electronic quality. Atomic force microscopy analysis shows that these crystals have improved surface roughness (root mean square value of only ?0.1?nm) compared to conventional SiO{sub 2} substrate. While our results confirm that graphene devices exhibit very high electronic mobility (?) on BN substrates, graphene devices on WS{sub 2} substrates (G/WS{sub 2}) are equally promising for high quality electronic transport (????38?000 cm{sup 2}/V s at room temperature), followed by G/MoS{sub 2} (????10?000 cm{sup 2}/V s) and G/GaSe (????2200 cm{sup 2}/V s). However, we observe a significant asymmetry in electron and hole conduction in G/WS{sub 2} and G/MoS{sub 2} heterostructures, most likely due to the presence of sulphur vacancies in the substrate crystals. GaSe crystals are observed to degrade over time even under ambient conditions, leading to a large hysteresis in graphene transport making it a less suitable substrate.

Tan, J. Y.; Avsar, A.; Balakrishnan, J.; Taychatanapat, T.; O'Farrell, E. C. T.; Eda, G.; Castro Neto, A. H. [Graphene Research Center, National University of Singapore, Singapore 117542 (Singapore); Department of Physics, National University of Singapore, Singapore 117542 (Singapore); Koon, G. K. W.; zyilmaz, B., E-mail: barbaros@nus.edu.sg [Graphene Research Center, National University of Singapore, Singapore 117542 (Singapore); Department of Physics, National University of Singapore, Singapore 117542 (Singapore); NanoCore, National University of Singapore, Singapore 117576 (Singapore); Watanabe, K.; Taniguchi, T. [National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044 (Japan)

2014-05-05T23:59:59.000Z

426

X-ray Microscopy and Imaging (XSD-XMI)  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Imaging (XMI) Imaging (XMI) About XMI Science and Research Beamlines Highlights Software and Tools Intranet Search APS... Argonne Home > Advanced Photon Source > Contacts FAQs Beamlines News Publications APS Email Portal APS Intranet APS Phonebook APS Quick Links for Users APS Safety and Training Welcome to the X-ray Microscopy and Imaging group (XMI)! X-ray Microscopy and Imaging is part of the X-ray Science Division at the Advanced Photon Source. We develop and support a diverse and multidisciplinary user research program at Sectors 2 and 32 of the APS, with the overall goal to image and study materials structures at spatial and temporal resolutions that are most scientifically relevant to the cutting-edge advances in materials, biological, environmental, and biomedical sciences. To achieve this goal, we actively engage in various research activities including

427

Acoustic microscopy for characterization of high?temperature superconducting tape  

Science Journals Connector (OSTI)

Although material scientists constantly discover superconducting compounds with higher critical temperatures (T c s) manufacturing of the high?temperature superconductors(HTS) remains a problem and long lengths (>1 mile) have yet to be produced. In an effort to produce long length superconductors manufacturing steps for HTS tape production have been critically looked at to find their effects in producing tape with the desired characteristics. In support of determining superconducting tapecharacteristics acoustic microscopy offers the potential for internal microstructural material characterization. This research will ultimately support in?process monitoring of HTSmanufacturing as part of an advanced sensing system to determine the presence of defects and/or the effects of process variables on the HTS tape. This presentation will overview scanning acoustic microscopy and present images of HTS tape at several frequencies ranging from 50 to 500 MHz. The results clearly demonstrate the feasibility of determining the Ag/ceramic interface location and the general integrity of the constituents.

Chiaki Miyasaka; Chris Cobucci; Bernhard Tittmann

1997-01-01T23:59:59.000Z

428

Single molecule microscopy in 3D cell cultures and tissues  

Science Journals Connector (OSTI)

Abstract From the onset of the first microscopic visualization of single fluorescent molecules in living cells at the beginning of this century, to the present, almost routine application of single molecule microscopy, the method has well-proven its ability to contribute unmatched detailed insight into the heterogeneous and dynamic molecular world life is composed of. Except for investigations on bacteria and yeast, almost the entire story of success is based on studies on adherent mammalian 2D cell cultures. However, despite this continuous progress, the technique was not able to keep pace with the move of the cell biology community to adapt 3D cell culture models for basic research, regenerative medicine, or drug development and screening. In this review, we will summarize the progress, which only recently allowed for the application of single molecule microscopy to 3D cell systems and give an overview of the technical advances that led to it. While initially posing a challenge, we finally conclude that relevant 3D cell models will become an integral part of the on-going success of single molecule microscopy.

Florian M. Lauer; Elke Kaemmerer; Tobias Meckel

2014-01-01T23:59:59.000Z

429

Atom probe field ion microscopy and related topics: A bibliography 1991  

SciTech Connect (OSTI)

This report contains a bibliography for 1991 on the following topics: Atom probe field ion microscopy; field desorption mass spectrometry; field emission; field ion microscopy; and field emission theory.

Russell, K.F.; Miller, M.K.

1993-01-01T23:59:59.000Z

430

Cellular resolution ex vivo imaging of gastrointestinal tissues with coherence microscopy  

E-Print Network [OSTI]

Optical coherence microscopy (OCM) combines confocal microscopy and optical coherence tomography (OCT) to improve imaging depth and contrast, enabling cellular imaging in human tissues. We aim to investigate OCM for ex ...

Fujimoto, James G.

431

New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution Print Wednesday, 31 August 2005 00:00...

432

Glossary Term - Electron Capture  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Electron Previous Term (Electron) Glossary Main Index Next Term (Electron Volt (eV)) Electron Volt (eV) Electron Capture After electron capture, an atom contains one less proton and one more neutron. Electron capture is one process that unstable atoms can use to become more stable. During electron capture, an electron in an atom's inner shell is drawn into the nucleus where it combines with a proton, forming a neutron and a neutrino. The neutrino is ejected from the atom's nucleus. Since an atom loses a proton during electron capture, it changes from one element to another. For example, after undergoing electron capture, an atom of carbon (with 6 protons) becomes an atom of boron (with 5 protons). Although the numbers of protons and neutrons in an atom's nucleus change

433

WHOLE CELL TOMOGRAPHY/MOLECULAR BIOLOGY/STRUCTURAL BIOLOGY: Affordable x-ray microscopy with nanoscale resolution  

SciTech Connect (OSTI)

Biological research spans 10 orders of magnitude from angstroms to meters. While electron microscopy can reveal structural details at most of these spatial length scales, transmission electron tomography only reliably reconstructs three-dimensional (3-D) volumes of cellular material with a spatial resolution between 1-5 nm from samples less than 500 nm thick1. Most biological cells are 2-30 times thicker than this threshold, which means that a cell must be cut into consecutive slices with each slice reconstructed individually in order to approximate the contextual information of the entire cell. Fortunately, due to a larger penetration depth2, X-ray computed tomography bypasses the need to physically section a cell and enables imaging of intact cells and tissues on the micrometer or larger scale with tens to hundreds of nanometer spatial resolution. While the technique of soft x-ray microscopy has been extensively developed in synchrotron facilities, advancements in laboratory x-ray source designs now increase its accessibility by supporting commercial systems suitable for a standard laboratory. In this paper, we highlight a new commercial compact cryogenic soft x-ray microscope designed for a standard laboratory setting and explore its capabilities for mesoscopic investigations of intact prokaryotic and eukaryotic cells.

Evans, James E.; Blackborow, Paul; Horne, Stephen J.; Gelb, Jeff

2013-03-01T23:59:59.000Z

434

Towards automatic cell identi cation in DIC microscopy , C.A. Glasbey2y  

E-Print Network [OSTI]

1998. Journal of Microscopy, 192, 186-193. #12;a b c Figure 1: DIC microscope images: a Chlorella algal

Stone, J. V.

435

Chemical, Electronic and Nanostructure Dynamics on Sr(Ti[subscript 1 - x]FE[subscript x])O[subscript 3] Thin-Film Surfaces at High Temperatures  

E-Print Network [OSTI]

The surface structure, chemical composition and electronic structure of Sr(Ti1-xFex)O3 under different temperatures and oxygen pressures were studied by Scanning Tunneling Microscopy / Spectroscopy (STM/S) and X-ray ...

Chen, Yan

436

Controlling Graphene's Electronic Structure  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in...

437

Controlling Graphene's Electronic Structure  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Controlling Graphene's Electronic Structure Print Wednesday, 25 April 2007 00:00 Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has...

438

Radiative polarization of electrons  

Science Journals Connector (OSTI)

We present a new method of calculating the radiative polarization of electrons in homogeneous magnetic fields, using the modified electron propagation function.

Julian Schwinger and Wu-yang Tsai

1974-03-15T23:59:59.000Z

439

Nano electron source fabricated by beam-induced deposition and its unique feature  

Science Journals Connector (OSTI)

Abstract The fabrication of nanoscale field emitters with gate structures using beam-induced deposition and their field emission properties are described. Nano electron sources can be fabricated by electron-beam-induced deposition without additional processes. The inherent issues of process contamination and the effectiveness of post cleaning using annealing or radical oxygen gas exposure to remove contaminants introduced during beam deposition are also discussed. In addition, coherent electron beams for electron wave interference emitted from a beam-deposited Pt field emitter were investigated by field emission microscopy and field ion microscopy. The interference fringe patterns observed for beam-deposited Pt field emitters were attributed to electron wave interference occurring at two adjacent emission sites on a single Pt nanocrystal.

Katsuhisa Murakami; Mikio Takai

2015-01-01T23:59:59.000Z

440

Cryogenic X-Ray Diffraction Microscopy for Biological Samples  

Science Journals Connector (OSTI)

X-ray diffraction microscopy (XDM) is well suited for nondestructive, high-resolution biological imaging, especially for thick samples, with the high penetration power of xrays and without limitations imposed by a lens. We developed nonvacuum, cryogenic (cryo-) XDM with hard xrays at 8keV and report the first frozen-hydrated imaging by XDM. By preserving samples in amorphous ice, the risk of artifacts associated with dehydration or chemical fixation is avoided, ensuring the imaging condition closest to their natural state. The reconstruction shows internal structures of intact D. radiodurans bacteria in their natural contrast.

Enju Lima; Lutz Wiegart; Petra Pernot; Malcolm Howells; Joanna Timmins; Federico Zontone; Anders Madsen

2009-11-05T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


441

Cryogenic X-ray Diffraction Microscopy for Biological Samples  

SciTech Connect (OSTI)

X-ray diffraction microscopy (XDM) is well suited for nondestructive, high-resolution biological imaging, especially for thick samples, with the high penetration power of x rays and without limitations imposed by a lens. We developed nonvacuum, cryogenic (cryo-) XDM with hard x rays at 8 keV and report the first frozen-hydrated imaging by XDM. By preserving samples in amorphous ice, the risk of artifacts associated with dehydration or chemical fixation is avoided, ensuring the imaging condition closest to their natural state. The reconstruction shows internal structures of intact D. radiodurans bacteria in their natural contrast.

E Lima; L Wiegart; P Pernot; M Howells; J Timmins; F Zontone; A Madsen

2011-12-31T23:59:59.000Z

442

Field-ion microscopy observation of single-walled carbon  

Science Journals Connector (OSTI)

Field-ion microscopy (FIM), a tool for surface analysis with atomic resolution, has been employed to observe the end structure of single-walled carbon nanotubes (SWCNTs). FIM images revealed the existence of open SWCNT ends. Amorphous carbon atoms were also observed to occur around SWCNTs and traditional field evaporation failed to remove them. Heat treatment was found to be efficacious in altering the end structures of SWCNT bundles. Carbon and oxygen atoms released from heated tungsten filament are believed to be responsible for the decoration imposed on the SWCNT ends.

Zhang Zhao-Xiang; Zhang Geng-Min; Du Min; Jin Xin-Xi; Hou Shi-Min; Sun Jian-Ping; Gu Zhen-Nan; Zhao Xing-Yu; Liu Wei-Min; Wu Jin-Lei; Xue Zeng-Quan

2002-01-01T23:59:59.000Z

443

Single Molecule Emission Characteristics in Near-Field Microscopy  

Science Journals Connector (OSTI)

In near-field scanning optical microscopy (NSOM), the measured fluorescence lifetime of a single dye molecule can be shortened or lengthened, sensitively dependent on the relative position between the molecule and aluminum coated fiber tip. The modified lifetimes and other emission characteristics are simulated by solving Maxwell equations with the finite-difference time-domain (FDTD) method. The 2D computation reveals insight into the lifetime behaviors and provides guidance for nonperturbative spectroscopic measurements with NSOM. This new methodology is capable of predicting molecular emission properties in front of a metal/dielectric interface of arbitrary geometry.

Randy X. Bian; Robert C. Dunn; X. Sunney Xie; P. T. Leung

1995-12-25T23:59:59.000Z

444

Direct and large scale electric arc discharge synthesis of boron and nitrogen doped single-walled carbon nanotubes and their electronic properties  

Science Journals Connector (OSTI)

Boron and nitrogen co-doped single-walled carbon nanotubes (BN-SWCNTs) were directly synthesized at large scale using an electric arc discharge method. X-ray photoelectron spectroscopy, scanning electron microscopy, transmission electron microscopy and UVvisNIR spectroscopy were performed to investigate structure and properties of BN-SWCNTs. These results show that the band gaps of \\{SWCNTs\\} have been tuned greatly with B and N doping.

Bin Wang; Yanfeng Ma; Yingpeng Wu; Na Li; Yi Huang; Yongsheng Chen

2009-01-01T23:59:59.000Z

445

Origin and control of magnetic exchange coupling in between focused electron beam deposited cobalt nanostructures  

SciTech Connect (OSTI)

We demonstrate the existence and control of inter-particle magnetic exchange coupling in densely packed nanostructures fabricated by focused electron beam induced deposition. With Xe beam post-processing, we have achieved the controlled reduction and eventual elimination of the parasitic halo-like cobalt deposits formed in the proximity of intended nanostructures, which are the identified source of the magnetic exchange coupling. The elimination of the halo-mediated exchange coupling is demonstrated by magnetic measurements using Kerr microscopy on Co pillar arrays. Electron microscopy studies allowed us to identify the mechanisms underlying this process and to verify the efficiency and opportunities of the described nano-scale fabrication approach.

Nikulina, E.; Idigoras, O.; Porro, J. M.; Berger, A. [CIC nanoGUNE Consolider, Tolosa Hiribidea 76, 20018 Donostia-San Sebastian (Spain)] [CIC nanoGUNE Consolider, Tolosa Hiribidea 76, 20018 Donostia-San Sebastian (Spain); Vavassori, P.; Chuvilin, A. [CIC nanoGUNE Consolider, Tolosa Hiribidea 76, 20018 Donostia-San Sebastian (Spain) [CIC nanoGUNE Consolider, Tolosa Hiribidea 76, 20018 Donostia-San Sebastian (Spain); Ikerbasque, Basque Foundation for Science, Alameda Urquijo 36-5, 48011 Bilbao (Spain)

2013-09-16T23:59:59.000Z

446

ELECTRONIC CHARTS INTRODUCTION  

E-Print Network [OSTI]

199 CHAPTER 14 ELECTRONIC CHARTS INTRODUCTION 1400. The Importance of Electronic Charts Since. Electronic charts automate the process of integrating real-time positions with the chart display and allow is expected to take and plot a fix every three minutes. An electronic chart system can do it once per second

New Hampshire, University of

447

Electronics, Electrical Engineering  

E-Print Network [OSTI]

SCHOOL OF Electronics, Electrical Engineering and Computer Science IS IN YOUR HANDS THE FUTURE #12;SCHOOL OF Electronics, Electrical Engineering and Computer Science2 CAREERS IN ELECTRONICS, ELECTRICAL Belfast. Ranked among the top 100 in the world for Electrical and Electronic Engineering (QS World

448

Imaging Local Electronic Corrugations and Doped Regions in Graphene  

SciTech Connect (OSTI)

Electronic structure heterogeneities are ubiquitous in two-dimensional graphene and profoundly impact the transport properties of this material. Here we show the mapping of discrete electronic domains within a single graphene sheet using scanning transmission X-ray microscopy in conjunction with ab initio density functional theory calculations. Scanning transmission X-ray microscopy imaging provides a wealth of detail regarding the extent to which the unoccupied levels of graphene are modified by corrugation, doping and adventitious impurities, as a result of synthesis and processing. Local electronic corrugations, visualized as distortions of the {pi}*cloud, have been imaged alongside inhomogeneously doped regions characterized by distinctive spectral signatures of altered unoccupied density of states. The combination of density functional theory calculations, scanning transmission X-ray microscopy imaging, and in situ near-edge X-ray absorption fine structure spectroscopy experiments also provide resolution of a longstanding debate in the literature regarding the spectral assignments of pre-edge and interlayer states.

B Schultz; C Patridge; V Lee; C Jaye; P Lysaght; C Smith; J Barnett; D Fischer; D Prendergast; S Banerjee

2011-12-31T23:59:59.000Z

449

Advanced Photon Source | Combining Scanning Probe Microscopy and  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

01.2013 01.2013 Nanoscience Seminar presented at Tokyo University On November 1, 2013, Volker Rose was invited to present the Nanoscience Seminar at the Institute of Solid State Physics (ISSP) of the University of Tokyo. In his seminar he discussed the physical principles of Synchrotron X-ray Scanning Tunneling Microscopy (SXSTM) as well as the recent progress made by his team at the Advanced Photon Source. He was invited by Prof. Yukio Hasegawa, who himself conducts SXSTM experiment at the Photon Factory in Tsukuba, Japan. The ISSP serves as the central laboratory of materials science in Japan equipped with state-of-art facilities. It was relocated to the new campus in Kashiwa of the University of Tokyo in 2000 after the 43 years of activities at the Roppongi campus in downtown Tokyo. Here ISSP is focusing

450

Advanced Photon Source | Combining Scanning Probe Microscopy and  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

APS APS SXSPM News Researchers from NSLS-II visit SXSPM team at Argonne (November 27, 2013) Cummings presents invited talk at magnetism meeting (November 11, 2013) Invited talk at ACSIN-12 & ICSPM21 in Japan (November 11, 2013) Nanoscience Seminar presented at Tokyo University (November 01, 2013) Scientists study old photos for new solutions to corrosion (October 21, 2013) More News Featured Image Recent Publications Kangkang Wang, Daniel Rosenmann, Martin Holt, Robert Winarski, Saw-Wai Hla, and Volker Rose, "An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy", Rev. Sci. Instrum. 84, 063704 (2013). More SXSPM Publications Upcoming Presentations V. Rose, 41st Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-41) (Invited Speaker)

451

Calibration of fluorescence resonance energy transfer in microscopy  

DOE Patents [OSTI]

Imaging hardware, software, calibrants, and methods are provided to visualize and quantitate the amount of Fluorescence Resonance Energy Transfer (FRET) occurring between donor and acceptor molecules in epifluorescence microscopy. The MicroFRET system compensates for overlap among donor, acceptor, and FRET spectra using well characterized fluorescent beads as standards in conjunction with radiometrically calibrated image processing techniques. The MicroFRET system also provides precisely machined epifluorescence cubes to maintain proper image registration as the sample is illuminated at the donor and acceptor excitation wavelengths. Algorithms are described that pseudocolor the image to display pixels exhibiting radiometrically-corrected fluorescence emission from the donor (blue), the acceptor (green) and FRET (red). The method is demonstrated on samples exhibiting FRET between genetically engineered derivatives of the Green Fluorescent Protein (GFP) bound to the surface of Ni chelating beads by histidine-tags.

Youvan, Douglas C. (San Jose, CA); Silva, Christopher M. (Sunnyvale, CA); Bylina, Edward J. (San Jose, CA); Coleman, William J. (Moutain View, CA); Dilworth, Michael R. (Santa Cruz, CA); Yang, Mary M. (San Jose, CA)

2002-09-24T23:59:59.000Z

452

Integrated fiducial sample mount and software for correlated microscopy  

SciTech Connect (OSTI)

A novel design sample mount with integrated fiducials and software for assisting operators in easily and efficiently locating points of interest established in previous analytical sessions is described. The sample holder and software were evaluated with experiments to demonstrate the utility and ease of finding the same points of interest in two different microscopy instruments. Also, numerical analysis of expected errors in determining the same position with errors unbiased by a human operator was performed. Based on the results, issues related to acquiring reproducibility and best practices for using the sample mount and software were identified. Overall, the sample mount methodology allows data to be efficiently and easily collected on different instruments for the same sample location.

Timothy R McJunkin; Jill R. Scott; Tammy L. Trowbridge; Karen E. Wright

2014-02-01T23:59:59.000Z

453

Nanoscale imaging of the electronic and structural transitions in vanadium dioxide.  

SciTech Connect (OSTI)

We investigate the electronic and structural changes at the nanoscale in vanadium dioxide (VO{sub 2}) in the vicinity of its thermally driven phase transition. Both electronic and structural changes exhibit phase coexistence leading to percolation. In addition, we observe a dichotomy between the local electronic and structural transitions. Nanoscale x-ray diffraction reveals local, nonmonotonic switching of the lattice structure, a phenomenon that is not seen in the electronic insulator-to-metal transition mapped by near-field infrared microscopy.

Qazilbash, M. M.; Tripathi, A.; Schafgans, A. A.; Kim, B.-J.; Kim, H.-T.; Cai, Z.; Holt, M. V.; Maser, J. M.; Keilmann, F.; Shpyrko, O. G.; Basov, D. N. (X-Ray Science Division); ( CNM); (Univ. of California at San Diego); (Electronics and Telecommunications Research IInst.); (Univ. of Science and Technology); (Munich Centre for Advanced Photonics and Center for NanoScience)

2011-04-13T23:59:59.000Z

454

Imaging and quantitative data acquisition of biological cell walls with Atomic Force Microscopy and Scanning Acoustic Microscopy  

SciTech Connect (OSTI)

This chapter demonstrates the feasibility of Atomic Force Microscopy (AFM) and High Frequency Scanning Acoustic Microscopy (HF-SAM) as tools to characterize biological tissues. Both the AFM and the SAM have shown to provide imaging (with different resolution) and quantitative elasticity measuring abilities. Plant cell walls with minimal disturbance and under conditions of their native state have been examined with these two kinds of microscopy. After descriptions of both the SAM and AFM, their special features and the typical sample preparation is discussed. The sample preparation is focused here on epidermal peels of onion scales and celery epidermis cells which were sectioned for the AFM to visualize the inner surface (closest to the plasma membrane) of the outer epidermal wall. The nm-wide cellulose microfibrils orientation and multilayer structure were clearly observed. The microfibril orientation and alignment tend to be more organized in older scales compared with younger scales. The onion epidermis cell wall was also used as a test analog to study cell wall elasticity by the AFM nanoindentation and the SAM V(z) feature. The novelty in this work was to demonstrate the capability of these two techniques to analyze isolated, single layered plant cell walls in their natural state. AFM nanoindentation was also used to probe the effects of Ethylenediaminetetraacetic acid (EDTA), and calcium ion treatment to modify pectin networks in cell walls. The results suggest a significant modulus increase in the calcium ion treatment and a slight decrease in EDTA treatment. To complement the AFM measurements, the HF-SAM was used to obtain the V(z) signatures of the onion epidermis. These measurements were focused on documenting the effect of pectinase enzyme treatment. The results indicate a significant change in the V(z) signature curves with time into the enzyme treatment. Thus AFM and HF-SAM open the door to a systematic nondestructive structure and mechanical property study of complex biological cell walls. A unique feature of this approach is that both microscopes allow the biological samples to be examined in their natural fluid (water) environment.

Tittmann, B. R. [Penn State; Xi, X. [Penn State

2014-09-01T23:59:59.000Z

455

Experimental procedures to mitigate electron beam induced artifacts during in situ fluid imaging of nanomaterials  

SciTech Connect (OSTI)

Currently there are few standardized experimental practices in the field of fluid stage transmission electron microscopy. To obtain consistency in this emerging field, a crucial step is to establish the common artifacts and electron beam-sample interactions that can occur. Recently many unintended phenomena have been observed during in situ fluid stage scanning transmission electron microscopy (STEM) experiments, including growth of crystals on the fluid stage windows, repulsion of particles from the irradiated area, bubble formation, and the loss of atomic information during prolonged imaging of individual nanoparticles. Here we provide a comprehensive review of these fluid stage artifacts, and we present new experimental evidence that sheds light on their origins in terms of experimental apparatus issues and indirect electron beam sample interactions with the fluid layer. The results here will provide a methodology for minimizing fluid stage imaging artifacts and acquiring quantitative in situ observations of nanomaterial behavior in a liquid environment.

Woehl, Taylor J.; Jungjohann, K. L.; Evans, James E.; Arslan, Ilke; Ristenpart, William D.; Browning, Nigel D.

2013-04-01T23:59:59.000Z

456

Foil Electron Multiplier  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Foil Electron Multiplier Foil Electron Multiplier Foil Electron Multiplier An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. Available for thumbnail of Feynman Center (505) 665-9090 Email Foil Electron Multiplier An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. The foil thickness enables the incident particles to travel through the foil and continue on

457

Fundamentals of Power Electronics  

Science Journals Connector (OSTI)

This chapter gives a description and overview of power electronic technologies including a description of the fundamental systems that are the building blocks of power electronic systems. Technologies that are de...

Edison R. C. da Silva; Malik E. Elbuluk

2013-01-01T23:59:59.000Z

458

Neutrinos in the Electron  

E-Print Network [OSTI]

We will show that one half of the rest mass of the electron is equal to the sum of the rest masses of electron neutrinos and that the other half of the rest mass of the electron is given by the energy in the sum of electric oscillations. With this composition we can explain the rest mass, the electric charge, the spin and the magnetic moment of the electron.

E. L. Koschmieder

2006-09-26T23:59:59.000Z

459

Dark Energy and Electrons  

E-Print Network [OSTI]

In the light of recent developments in Dark Energy, we consider the electron in a such a background field and show that at the Compton wavelength the electron is stable, in that the Cassini inward pressure exactly counterbalances the outward Coulomb repulsive pressure thus answering a problem of the earlier electron theory.

Burra G. Sidharth

2008-08-05T23:59:59.000Z

460

Scanning Tunneling Microscopy Study of Molybdenum Disulfide and its Derivatives on Cu(111)  

E-Print Network [OSTI]

principles electronic structure calculations . 27 3.1principles electronic structure calculations The followingFirst-principles electronic structure calculations, Physical

Lu, Wenhao

2014-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


461

Cell Division Stage in C. elegans Imaged Using Third Harmonic Generation Microscopy  

Science Journals Connector (OSTI)

C. elegans embryogenesis, at the cell division stage, was imaged using third harmonic generation microscopy employing ultrashort pulsed lasers at 1028nm and 1550nm. This technique...

Aviles-Espinosa, Rodrigo; Tserevelakis, G J; Santos, Susana I c o; Filippidis, G; Krmpot, A J; Vlachos, M; Tavernarakis, N; Brodschelm, A; Kaenders, W; Artigas, David; Loza-Alvarez, Pablo

462

Label-free hyperspectral nonlinear optical microscopy of the biofuel micro-algae Haematococcus Pluvialis  

Science Journals Connector (OSTI)

We consider multi-modal four-wave mixing microscopies to be ideal tools for the in vivo study of carotenoid distributions within the important biofuel microalgae Haematococcus...

Barlow, Aaron M; Slepkov, Aaron D; Ridsdale, Andrew; McGinn, Patrick J; Stolow, Albert

2014-01-01T23:59:59.000Z

463

Pixel super-resolution in serial time-encoded amplified microscopy (STEAM)  

Science Journals Connector (OSTI)

We propose pixel super-resolution serial time-encoded amplified microscopy (STEAM) for achieves high speed and high-resolution imaging - relaxing the stringent requirement on the...

Wong, Terence T W; Chan, Antony; Wong, Kenneth K Y; Tsia, Kevin K

464

Coherence-Controlled Holographic Microscopy for Coherence-Gated Quantitative Phase Imaging  

Science Journals Connector (OSTI)

We show that the use of incoherent illumination in coherence-controlled holographic microscopy (CCHM) enables coherence-gated quantitative phase imaging of objects through turbid...

Slaby, Tomas; Kolman, Pavel; Dostal, Zbynek; Antos, Martin; Lostak, Martin; Krizova, Aneta; Collakova, Jana; Kollarova, Vera; Slaba, Michala; Vesely, Pavel; Chmelik, Radim

465

E-Print Network 3.0 - absorption spectroscopic microscopy Sample...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

version of scanning near-field optical microscopy (SNOM). The tunable infrared radiation... the l 3.5 mm, CH vibrational stretch mode absorption band. ... Source:...

466

Data Reduction Enables Massive Data Handling in Super-resolution Localization Microscopy  

Science Journals Connector (OSTI)

Massive data handling is the major challenge in super-resolution localization microscopy. Here we present a data reduction approach to solve this challenge. This approach enables the...

Ma, Hongqiang; Zeng, Shaoqun; Huang, Zhen-li

467

An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy  

SciTech Connect (OSTI)

In order to achieve elemental and chemical sensitivity in scanning tunneling microscopy (STM), synchrotron x-rays have been applied to excite core-level electrons during tunneling. The x-ray photo-excitations result in tip currents that are superimposed onto conventional tunneling currents. While carrying important physical information, the varying x-ray induced currents can destabilize the feedback loop causing it to be unable to maintain a constant tunneling current, sometimes even causing the tip to retract fully or crash. In this paper, we report on an easy-to-implement filter circuit that can separate the x-ray induced currents from conventional tunneling currents, thereby allowing simultaneous measurements of topography and chemical contrasts. The filter and the schematic presented here can also be applied to other variants of light-assisted STM such as laser STM.

Wang Kangkang; Rosenmann, Daniel; Holt, Martin; Winarski, Robert; Hla, Saw-Wai [Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States); Rose, Volker [Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States); Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States)

2013-06-15T23:59:59.000Z

468

Scanning tunneling microscopy on unpinned GaN(1100) surfaces: Invisibility of valence-band states  

Science Journals Connector (OSTI)

We investigated the origins of the tunnel current in scanning tunneling microscopy (STM) and spectroscopy experiments on GaN(1100) surfaces. By calculating the tunnel currents in the presence of a tip-induced band bending for unpinned n-type GaN(1100) surfaces, we demonstrate that only conduction-band states are observed at positive and negative voltage polarities independent of the doping concentration. Valence-band states remain undetectable because tunneling out of the electron-accumulation zone in conduction-band states dominates by four orders of magnitude. As a result band-gap sizes cannot be determined by STM on unpinned GaN(1100) surfaces. Appropriate band-edge positions and gap sizes can be determined on pinned surfaces.

Ph. Ebert, L. Ivanova, and H. Eisele

2009-08-24T23:59:59.000Z

469

Sensors, Electronics & Instrumentation  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Sensors, Electronics & Instrumentation Sensors, Electronics & Instrumentation Sensors, Electronics & Instrumentation Express Licensing Acoustic Concentration Of Particles In Fluid Flow Express Licensing Apparatus And Method For Hydrogen And Oxygen Mass Spectrometry Of The Terrestrial Magnetosphere Express Licensing Apparatus And Method For Temperature Correction And Expanded Count Rate Of Inorganic Scintillation Detectors Express Licensing Composition and method for removing photoresist materials from electronic components Express Licensing Corrosion Test Cell For Bipolar Plates Express Licensing Cylindrical Acoustic Levitator/Concentrator Negotiable Licensing Electrochemical Apparatus with Disposable and Modifiable Parts Express Licensing Foil electron multiplier Express Licensing Hydrogen Sensor

470

Ultracold Electron Source  

Science Journals Connector (OSTI)

We propose a technique for producing electron bunches that has the potential for advancing the state-of-the-art in brightness of pulsed electron sources by orders of magnitude. In addition, this method leads to femtosecond bunch lengths without the use of ultrafast lasers or magnetic compression. The electron source we propose is an ultracold plasma with electron temperatures down to 10K, which can be fashioned from a cloud of laser-cooled atoms by photoionization just above threshold. Here we present results of simulations in a realistic setting, showing that an ultracold plasma has an enormous potential as a bright electron source.

B. J. Claessens; S. B. van der Geer; G. Taban; E. J. D. Vredenbregt; O. J. Luiten

2005-10-12T23:59:59.000Z

471

Vehicle Technologies Office: Power Electronics  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Power Electronics to Power Electronics to someone by E-mail Share Vehicle Technologies Office: Power Electronics on Facebook Tweet about Vehicle Technologies Office: Power Electronics on Twitter Bookmark Vehicle Technologies Office: Power Electronics on Google Bookmark Vehicle Technologies Office: Power Electronics on Delicious Rank Vehicle Technologies Office: Power Electronics on Digg Find More places to share Vehicle Technologies Office: Power Electronics on AddThis.com... Just the Basics Hybrid & Vehicle Systems Energy Storage Advanced Power Electronics & Electrical Machines Power Electronics Electrical Machines Thermal Control & System Integration Advanced Combustion Engines Fuels & Lubricants Materials Technologies Power Electronics The power electronics activity focuses on research and development (R&D)

472

Electron Injector Studies at LBL  

E-Print Network [OSTI]

Measurements at the SLC Electron Source", J.Sodja, M.J.great interested in bright electron sources because they areintensity brighter electron sources that the conventional

Kim, C.H.

2010-01-01T23:59:59.000Z

473

Band excitation method applicable to scanning probe microscopy  

DOE Patents [OSTI]

Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.

Jesse, Stephen; Kalinin, Sergei V

2013-05-28T23:59:59.000Z

474

Detection of protein conformation defects from fluorescence microscopy images  

Science Journals Connector (OSTI)

Abstract A diagnostic method for protein conformational diseases (PCD) from microscopy images is proposed when such conformational conflicts involve muscular intranuclear inclusions (INIs) indicative of oculopharyngeal muscular dystrophy (OPMD), one variety of PCD. The method combines two techniques: (1) the Histogram Region of Interest Fixed by Thresholds (HRIFT) is designed to capture the color information of \\{INIs\\} for basic feature extraction; (2) an automated feature synthesis, based on the HRIFT features, is designed to identify OPMD by means of Genetic Programming and the Expectation Maximization algorithm (GP-EM) for classification improvement. With variations in size, shape, and background structure, a total of 600 microscopic images are analyzed for the binary classes of healthy and sick conditions of OPMD. The integrated technique of the approach reveals a sensitivity of 0.9 and an area of 0.961 under the receiver operating characteristic (ROC) at a specificity of 0.95. Furthermore, significant improvements in classification accuracy and computational time are demonstrated by comparison with other methods.

Peifang Guo; Prabir Bhattacharya

2013-01-01T23:59:59.000Z

475

Detecting Plasmon Resonance Energy Transfer with Differential Interference Contrast Microscopy  

SciTech Connect (OSTI)

Gold nanoparticles are ideal probes for studying intracellular environments and energy transfer mechanisms due to their plasmonic properties. Plasmon resonance energy transfer (PRET) relies on a plasmonic nanoparticle to donate energy to a nearby resonant acceptor molecule, a process which can be observed due to the plasmonic quenching of the donor nanoparticle. In this study, a gold nanosphere was used as the plasmonic donor, while the metalloprotein cytochrome c was used as the acceptor molecule. Differential interference contrast (DIC) microscopy allows for simultaneous monitoring of complex environments and noble metal nanoparticles in real time. Using DIC and specially designed microfluidic channels, we were able to monitor PRET at the single gold particle level and observe the reversibility of PRET upon the introduction of phosphate-buffered saline to the channel. In an additional experiment, single gold particles were internalized by HeLa cells and were subsequently observed undergoing PRET as the cell hosts underwent morphological changes brought about by ethanol-induced apoptosis.

Augspurger, Ashley E. [Ames Laboratory; Stender, Anthony S. [Ames Laboratory; Han, Rui [Ames Laboratory; Fang, Ning [Ames Laboratory

2013-12-30T23:59:59.000Z

476

Single molecule junctions, where a molecule with its perfect chemical reproducibility and versatility is the active part of an electronic device,  

E-Print Network [OSTI]

Single molecule junctions, where a molecule with its perfect chemical reproducibility of modern electronics. Quantum dot molecules (QDM) represent a top-down one. A QDM is composed of two characteristics of nanojunctions both in the single electron transistor and the scanning tunneling microscopy (STM

Schubart, Christoph

477

TRANSMISSION ELECTRON MICROSCOPY ANALYSIS OF A PRESOLAR SPINEL GRAIN. T. J. Ze-, C. M. O'D. Alexander2  

E-Print Network [OSTI]

Federal Reserve Bank of Boston Fidelity Investments First Wind Forest Laboratories, Inc. General Electric Company General Mills Hasbro, Inc. Houghton Mifflin Harcourt IBM Global Services Johnson & Johnson Jones

Nittler, Larry R.

478

Thermodynamics and kinetics of hydrophobic organic compound sorption in natural sorbents and quantification of black carbon by electron microscopy  

E-Print Network [OSTI]

The sorption behaviors of hydrophobic organic compounds (HOCs) in sediments were investigated using pyrene. Native pyrene desorbed slowly, taking from weeks to months to equilibrate. The end-point data suggested that, at ...

Kuo, Dave Ta Fu, 1978-

2010-01-01T23:59:59.000Z

479

In-Situ Transmission Electron Microscopy Probing of Native Oxide and Artificial Layers on Silicon Nanoparticles for Lithium Ion Batteries  

SciTech Connect (OSTI)

Surface modification of silicon nanoparticle via molecular layer deposition (MLD) has been recently proved to be an effective way for dramatically enhancing the cyclic performance in lithium ion batteries. However, the fundamental mechanism as how this thin layer of coating function is not known, which is even complicated by the inevitable presence of native oxide of several nanometers on the silicon nanoparticle. Using in-situ TEM, we probed in detail the structural and chemical evolution of both uncoated and coated silicon particles upon cyclic lithiation/delithation. We discovered that upon initial lithiation, the native oxide layer converts to crystalline Li2O islands, which essentially increases the impedance on the particle, resulting in ineffective lithiation/delithiation, and therefore low coulombic efficiency. In contrast, the alucone MLD coated particles show extremely fast, thorough and highly reversible lithiation behaviors, which are clarified to be associated with the mechanical flexibility and fast Li+/e- conductivity of the alucone coating. Surprisingly, the alucone MLD coating process chemically changes the silicon surface, essentially removing the native oxide layer and therefore mitigates side reaction and detrimental effects of the native oxide. This study provides a vivid picture of how the MLD coating works to enhance the coulombic efficiency and preserve capacity and clarifies the role of the native oxide on silicon nanoparticles during cyclic lithiation and delithiation. More broadly, this work also demonstrated that the effect of the subtle chemical modification of the surface during the coating process may be of equal importance as the coating layer itself.

He, Yang; Piper, Daniela M.; Gu, Meng; Travis, Jonathan J.; George, Steven M.; Lee, Se-Hee; Genc, Arda; Pullan, Lee; Liu, Jun; Mao, Scott X.; Zhang, Jiguang; Ban, Chunmei; Wang, Chong M.

2014-10-27T23:59:59.000Z

480

PROGRESS OF ELECTRON MICROSCOPY OF WET SPECIMENS USING FILM-SEALED ENVIRONMENTAL CELL: ITS SERIOUS PROBLEMS FOR BIOLOGICAL MATERIALS  

Science Journals Connector (OSTI)

......problems for observing biological materials are given in this lecture...pressure difference of the cell, handling during the preparation and...the observation of hydrated materials at lower gas pressure. The...IO-3OmlitlOOk l Fig.3. Gas flow diagram of E.C. Fig.5. Resolving......

Akira Fukami; Satoru Murakami

1979-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "ncem electron microscopy" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
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481

Phase identifications in crud from commercial boiling-water reactors at the Idaho National Laboratory by transmission electron microscopy  

SciTech Connect (OSTI)

Summarizes results of two studies of "crud" at the INL. All data is from INL/EXT-06-11742 and INL/JOU-06-11507 and has been previously released for publication.

Dawn E. Janney; Douglas L. Porter; Joshua L. Peterson

2007-09-01T23:59:59.000Z

482

Electron Microscopy and Analytical X-ray Characterization of Compositional and Nanoscale Structural Changes in Fossil Bone  

E-Print Network [OSTI]

on the identification of surviving collagen in bulk bonebulk regions of bone. This fact might prove exceptionally true if the identification

Boatman, Elizabeth

2012-01-01T23:59:59.000Z

483

PHILOSOPHICAL MAGAZINE LETTERS, 2000, VOL. 80, NO. 6, 381 386 High-resolution electron microscopy of a microporous  

E-Print Network [OSTI]

/ISSN 1362± 3036 online # 2000 Taylor & Francis Ltd http://www.tandf.co.uk/journals } Email: p.j.f.harris of a microporous carbon P.J. F. HARRISy}, A.BURIANz} and S. DUBERk y Department of Chemistry, University of Reading (Harris 1997). Recently, it has been suggested that microporous, non-graphitizing carbons might have

Harris, Peter J F

484

A scanning electron microscopy study of diseased root surfaces conditioned with EDTA gel plus Cetavlon after scaling and root planing  

Science Journals Connector (OSTI)

......analysis The results from the semi-quantitative analysis were evaluated using a nonparametric analysis of variance (Kruskal-Wallis test) followed by a Dunn's post test to compare all pairs of data. Results In control groups 1 and 3, which......

Walter Martins Jnior; Andiara De Rossi; Ricardo Samih Georges Abi Rached; Marcos Antonio Rossi

2011-04-01T23:59:59.000Z

485

Investigation of aged organic solar cell stacks by cross-sectional transmission electron microscopy coupled with elemental analysis  

Science Journals Connector (OSTI)

Polymer solar cells are of great interest as candidates for...61...-butyric acid methyl ester (P3HT and PCBM, respectively). Phase segregation of the blend has been extensively investigated by transmission electr...

P. Favia; E. Voroshazi; P. Heremans; H. Bender

2013-04-01T23:59:59.000Z

486

Investigating Local Degradation and Thermal Stability of Charged Nickel-Based Cathode Materials through Real-Time Electron Microscopy  

Science Journals Connector (OSTI)

The cathode part was prepared from a mixed slurry of 90 wt % active material (NCA), 6 wt % conducting carbon, and 4 wt % poly(vinylidene difluoride) (PVDF) binder in N-methylpyrrolidone (NMP) solvent. ... The observed differences in thermal decomposition behavior can be caused by a number of factors, including kinetic effects that occur during initial charge or heating, inhomogeneous dispersion of active materials, conducting agents, and polymer binder in the mixed slurry of the cathode, and the degree of electrolyte impregnation into the cathode. ... Real-time TEM has been used to describe the thermal decomposition that occurs at the surface of LixNi0.8Co0.15Al0.05O2 cathodes. ...

Sooyeon Hwang; Seung Min Kim; Seong-Min Bak; Byung-Won Cho; Kyung Yoon Chung; Jeong Yong Lee; Wonyoung Chang; Eric A. Stach

2014-08-07T23:59:59.000Z

487

In situ crystallization of barium zinc silicate in glass-ceramics studied by hot stage scanning electron microscopy  

Science Journals Connector (OSTI)

......Glasses and glass ceramics with blue, green and red photoluminescence. Phys. Chem...implications for melt inclusion analysis. Am. Mineral. (2006) 91:667-679. doi:10...formation of gold nanoparticles in soda lime silicate glass: suppressed Ostwald ripening......

Christian Bocker; Marlen Michaelis; Christian Rssel

2012-12-01T23:59:59.000Z

488

STRUCTURAL AND CHEMICAL STUDIES ON CdTe/CdS THIN FILM SOLAR CELLS WITH ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY  

E-Print Network [OSTI]

STRUCTURAL AND CHEMICAL STUDIES ON CdTe/CdS THIN FILM SOLAR CELLS WITH ANALYTICAL TRANSMISSION, A. N. Tiwari Thin Film Physics Group, Laboratory for Solid State Physics, Technopark ETH-Building, Technoparkstr. 1, CH-8005 Zurich, Switzerland ABSTRACT: CdTe/CdS thin £lm solar cells have been grown by closed

Romeo, Alessandro

489

Vacancy Ordering in -Fe2O3: Synchrotron X-ray Powder Diffraction and High-Resolution Electron Microscopy Studies  

Science Journals Connector (OSTI)

The structure refinement and estimation of various models of vacancy ordering in -Fe2O3 were performed. Attention is paid to the superstructure orientation with respect to well developed planes of microcrystals that depend on the precursor.

Shmakov, A.N.

1995-04-01T23:59:59.000Z

490

Biochemical Dissection of the CerebellumSubcellular Fractionation of Rat Cerebellum. Electron Microscopy: A Guide and Safeguard  

Science Journals Connector (OSTI)

The neuropil in various layers of the cerebellar cortex has characteristic features (Eccles et al., 1967; Palay and Chan-Palay, 1974) that offer certain advantages in studies aimed at isolating morphologically re...

F. Hajs; G. P. Wilkin

1975-01-01T23:59:59.000Z

491

Electron microscopy studies of akermanites (Ca1?xSrx)2CoSi2O7 with modulated structure  

Science Journals Connector (OSTI)

Single crystals of akermanite (Ca1?x Sr x )2Co-Si2O7 solid solution were grown in nitrogen by the floating zone method using a lamp-image furnace. The grown cryst...

K. Iishi; K. Fujino; Y. Furukawa

1990-12-01T23:59:59.000Z

492

Thin Film Morphology Control by Mechanical, Electronic and Chemical Interactions: a Scanning Tunneling Microscopy and Photoelectron Spectroscopy Study  

E-Print Network [OSTI]

17 UHV System and2-6 Schematic diagram of a my UHV-LT STM design in both top? ? . STM Instrumentation UHV System and Cyrostat In many

Sun, Dezheng

2012-01-01T23:59:59.000Z

493

Nanostructure, Chemistry and Crystallography of Iron Nitride Magnetic Materials by Ultra-High-Resolution Electron Microscopy and Related Methods  

Broader source: Energy.gov [DOE]

2011 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies Program Annual Merit Review and Peer Evaluation

494

Aberration-corrected electron microscopy of MnAs and As nanocrystals and voids in annealed (Ga,Mn)As  

E-Print Network [OSTI]

were grown at 270 °C using an As2 flux generated by a DCA valve cracker effusion cell with an As aberration coefficient (Cs) was used. The beam convergence semi-angle used for STEM was 15.7 mrad. The inner

Dunin-Borkowski, Rafal E.

495

Windows on a Lilliputian world: a personal perspective on the development of electron microscopy in the twentieth century  

Science Journals Connector (OSTI)

...concluded that the EMU provided a high-quality service at relatively low cost. By then...change in policy. It was impossible to increase contract work and meet the needs of the...Spanner.) Figure 5 The EM6B TEM in the old wine cellar of The Holme, July 1981, photographed...

2009-01-01T23:59:59.000Z

496

Bioactivity and the First Transmission Electron Microscopy Immunogold Studies of Short De Novo-Designed Antimicrobial Peptides  

Science Journals Connector (OSTI)

...peptide was recovered via vacuum filtration through a...from each sample was vacuum centrifuged overnight...Vacufuge 5301 centrifugal vacuum concentrator. Peptide...CD spectroscopy and 1H nuclear magnetic resonance...filled with LR White-accelerator solution (2 drops of...

Marisa Ann Azad; Heidi Esther Katrina Huttunen-Hennelly; Cynthia Ross Friedman

2011-02-07T23:59:59.000Z

497

ELECTRON MICROSCOPY ANALYSIS OF SILICON ISLANDS AND LINE STRUC-TURES FORMED ON SCREEN-PRINTED AL-DOPED P+  

E-Print Network [OSTI]

silicon wafers are mainly used as back surface field (BSF) in p-type crystalline silicon solar cells [1,2] and as rear side emitter in screen-printed back junction n-type crystalline silicon solar cells [3]. From dop in an infrared conveyor belt furnace at 900°C for 13 seconds. In order to investigate the p + surface

498

Spin torque and heating effects in current-induced domain wall motion probed by transmission electron microscopy  

E-Print Network [OSTI]

Spin torque and heating effects in current-induced domain wall motion probed by transmission- ternative to the use of conventional external magnetic fields, therefore opening up a route for simple device fabrication, where no field-generating strip lines are necessary. While current-induced domain

Dunin-Borkowski, Rafal E.

499

Laser-Scanning Coherent Anti-Stokes Raman Scattering Microscopy and Applications to Cell Biology  

E-Print Network [OSTI]

Laser-Scanning Coherent Anti-Stokes Raman Scattering Microscopy and Applications to Cell Biology Ji 11747-3157 USA ABSTRACT Laser-scanning coherent anti-Stokes Raman scattering (CARS) microscopy with fast., 1990). Duncan et al. constructed the first CARS microscope by use of two dye laser beams

Xie, Xiaoliang Sunney

500

ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE-EDGE SCANNING MICROSCOPY  

E-Print Network [OSTI]

ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE- EDGE SCANNING MICROSCOPY A Thesis Science #12;ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE- EDGE SCANNING MICROSCOPY A Thesis) ______________________________ ______________________________ Ergun Akleman Valerie Taylor (Member) (Head of Department) December 2003 Major Subject: Computer Science

Keyser, John