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Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
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1

Scanning Probe Microscopy Studies of Carbon Nanotubes  

E-Print Network (OSTI)

Scanning Probe Microscopy Studies of Carbon Nanotubes Teri Wang Odom1 , Jason H. Hafner1 relationship between Single-Walled Carbon Nanotube (SWNT) atomic structure and electronic properties, (2, properties and application of carbon nanotube probe microscopy tips to ultrahigh resolution and chemically

Odom, Teri W.

2

Band excitation method applicable to scanning probe microscopy  

DOE Patents (OSTI)

Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.

Jesse, Stephen; Kalinin, Sergei V

2013-05-28T23:59:59.000Z

3

Electron and Scanning Probe Microscopies | U.S. DOE Office of Science (SC)  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron and Scanning Probe Microscopies Electron and Scanning Probe Microscopies Materials Sciences and Engineering (MSE) Division MSE Home About Research Areas Energy Frontier Research Centers (EFRCs) DOE Energy Innovation Hubs BES Funding Opportunities The Computational Materials and Chemical Sciences Network (CMCSN) Theoretical Condensed Matter Physics Scientific Highlights Reports and Activities Principal Investigators' Meetings BES Home Research Areas Electron and Scanning Probe Microscopies Print Text Size: A A A RSS Feeds FeedbackShare Page This research area supports basic research in condensed matter physics and materials physics using electron scattering and microscopy and scanning probe techniques. The research includes experiments and theory to understand the atomic, electronic, and magnetic structures of materials.

4

Scanning probe microscopy with inherent disturbance suppression using micromechanical systems  

E-Print Network (OSTI)

All scanning probe microscopes (SPMs) are affected by disturbances, or mechanical noise, in their environments which can limit their imaging resolution. This thesis introduces a general approach for suppressing out-of-plane ...

Sparks, Andrew William, 1977-

2005-01-01T23:59:59.000Z

5

Scanning Hall probe microscopy of a diluted magnetic semiconductor  

SciTech Connect

We have measured the micromagnetic properties of a diluted magnetic semiconductor as a function of temperature and applied field with a scanning Hall probe microscope built in our laboratory. The design philosophy for this microscope and some details are described. The samples analyzed in this work are Ga{sub 0.94}Mn{sub 0.06}As films grown by molecular beam epitaxy. We find that the magnetic domains are 2-4 mum wide and fairly stable with temperature. Magnetic clusters are observed above T{sub C}, which we ascribe to MnAs defects too small and sparse to be detected by a superconducting quantum interference device magnetometer.

Kweon, Seongsoo [Materials Science and Engineering, University of Texas at Austin, Austin, Texas 78712 (United States); Samarth, Nitin [Physics Department, Penn State University, University Park, Pennsylvania 16802 (United States); Lozanne, Alex de [Materials Science and Engineering, University of Texas at Austin, Austin, Texas 78712 (United States); Department of Physics, University of Texas at Austin, Austin, Texas 78712 (United States)

2009-05-01T23:59:59.000Z

6

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

01.2013 01.2013 Nanoscience Seminar presented at Tokyo University On November 1, 2013, Volker Rose was invited to present the Nanoscience Seminar at the Institute of Solid State Physics (ISSP) of the University of Tokyo. In his seminar he discussed the physical principles of Synchrotron X-ray Scanning Tunneling Microscopy (SXSTM) as well as the recent progress made by his team at the Advanced Photon Source. He was invited by Prof. Yukio Hasegawa, who himself conducts SXSTM experiment at the Photon Factory in Tsukuba, Japan. The ISSP serves as the central laboratory of materials science in Japan equipped with state-of-art facilities. It was relocated to the new campus in Kashiwa of the University of Tokyo in 2000 after the 43 years of activities at the Roppongi campus in downtown Tokyo. Here ISSP is focusing

7

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

27.2013 27.2013 Researchers from NSLS-II visit SXSPM team at Argonne Synchrotron x-ray scanning tunneling microscopy will soon also be developed at the National Synchrotron Light Source (NSLS-II) at Brookhaven National Laboratory (BNL). In order to establish collaboration between the two National Laboratories, Drs. Evgeny Nazaretski and Hui Yan fom BNL visited Argonne to learn more about recent progress made in the SXSPM project. During the 2-day visit the teams discussed mutual scientific goals and strategies to achieve them. NSLS-II will be a new state-of-the-art, medium-energy electron storage ring at BNL designed to deliver high intensity and brightness. Construction of the NSLS-II's ring building began in March 2009. The new facility will begin operating in 2014

8

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

APS APS SXSPM News Researchers from NSLS-II visit SXSPM team at Argonne (November 27, 2013) Cummings presents invited talk at magnetism meeting (November 11, 2013) Invited talk at ACSIN-12 & ICSPM21 in Japan (November 11, 2013) Nanoscience Seminar presented at Tokyo University (November 01, 2013) Scientists study old photos for new solutions to corrosion (October 21, 2013) More News Featured Image Recent Publications Kangkang Wang, Daniel Rosenmann, Martin Holt, Robert Winarski, Saw-Wai Hla, and Volker Rose, "An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy", Rev. Sci. Instrum. 84, 063704 (2013). More SXSPM Publications Upcoming Presentations V. Rose, 41st Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-41) (Invited Speaker)

9

Scanning Hall Probe Microscopy of Magnetic Vortices inVery Underdoped yttrium-barium-copper-oxide  

SciTech Connect

Since their discovery by Bednorz and Mueller (1986), high-temperature cuprate superconductors have been the subject of intense experimental research and theoretical work. Despite this large-scale effort, agreement on the mechanism of high-T{sub c} has not been reached. Many theories make their strongest predictions for underdoped superconductors with very low superfluid density n{sub s}/m*. For this dissertation I implemented a scanning Hall probe microscope and used it to study magnetic vortices in newly available single crystals of very underdoped YBa{sub 2}Cu{sub 3}O{sub 6+x} (Liang et al. 1998, 2002). These studies have disproved a promising theory of spin-charge separation, measured the apparent vortex size (an upper bound on the penetration depth {lambda}{sub ab}), and revealed an intriguing phenomenon of ''split'' vortices. Scanning Hall probe microscopy is a non-invasive and direct method for magnetic field imaging. It is one of the few techniques capable of submicron spatial resolution coupled with sub-{Phi}{sub 0} (flux quantum) sensitivity, and it operates over a wide temperature range. Chapter 2 introduces the variable temperature scanning microscope and discusses the scanning Hall probe set-up and scanner characterizations. Chapter 3 details my fabrication of submicron GaAs/AlGaAs Hall probes and discusses noise studies for a range of probe sizes, which suggest that sub-100 nm probes could be made without compromising flux sensitivity. The subsequent chapters detail scanning Hall probe (and SQUID) microscopy studies of very underdoped YBa{sub 2}Cu{sub 3}O{sub 6+x} crystals with T{sub c} {le} 15 K. Chapter 4 describes two experimental tests for visons, essential excitations of a spin-charge separation theory proposed by Senthil and Fisher (2000, 2001b). We searched for predicted hc/e vortices (Wynn et al. 2001) and a vortex memory effect (Bonn et al. 2001) with null results, placing upper bounds on the vison energy inconsistent with the theory. Chapter 5 discusses imaging of isolated vortices as a function of T{sub c}. Vortex images were fit with theoretical magnetic field profiles in order to extract the apparent vortex size. The data for the lowest T{sub c}'s (5 and 6.5 K) show some inhomogeneity and suggest that {lambda}{sub ab} might be larger than predicted by the T{sub c} {proportional_to} n{sub s}(0)/m* relation first suggested by results of Uemura et al. (1989) for underdoped cuprates. Finally, Chapter 6 examines observations of apparent ''partial vortices'' in the crystals. My studies of these features indicate that they are likely split pancake vortex stacks. Qualitatively, these split stacks reveal information about pinning and anisotropy in the samples. Collectively these magnetic imaging studies deepen our knowledge of cuprate superconductivity, especially in the important regime of low superfluid density.

Guikema, Janice Wynn; /SLAC, SSRL

2005-12-02T23:59:59.000Z

10

Bioelectrical SPMs (G. Gomila, UB-IBEC) Bioelectric Scanning Probe Microscopies  

E-Print Network (OSTI)

-ups: Micropippete based electrodes Measurements of cell membrane ion transport on single cells 2. Scanning Ion (SNOM),Scanning Tunneling Microscope (STM), Scanning Ion Conductance Microscope (SICM), Scanning Conductance Microscopy #12;7 Bioelectrical SPMs (G. Gomila, UB-IBEC) Single ion channels recordings Average

Ritort, Felix

11

Switchable stiffness scanning microscope probe  

E-Print Network (OSTI)

Atomic Force Microscopy (AFM) has rapidly gained widespread utilization as an imaging device and micro/nano-manipulator during recent years. This thesis investigates the new concept of a dual stiffness scanning probe with ...

Mueller-Falcke, Clemens T. (Clemens Tobias)

2005-01-01T23:59:59.000Z

12

Scanning transmission X-ray microscopy probe for in situ mechanism study of graphene-oxide-based resistive random access memory  

Science Journals Connector (OSTI)

An in situ probe for scanning transmission X-ray microscopy has been developed and applied to the study of the bipolar resistive switching mechanism in an Al/graphene oxide/Al resistive random access memory device.

Nho, H.W.

2013-11-28T23:59:59.000Z

13

Probing the electronic structure of graphene sheets with various thicknesses by scanning transmission X-ray microscopy  

SciTech Connect

The electronic structure of an aggregation of graphene sheets with various thicknesses was probed by scanning transmission X-ray microscopy. A uniform oxidation of the graphene sheets in the flat area was observed regardless of the thickness, while in the folded area the result could be strongly affected by the geometry. Moreover, thick parts of the aggregation showed strong angle-dependence to the incident X-ray, while thin parts showed less angle-dependence, which might be related to the surface wrinkles and ripples. The electronic structure differences due to the geometry and thickness suggest a complicated situation in the aggregation of graphene sheets.

Bai, Lili; Liu, Jinyin; Zhao, Guanqi; Gao, Jing; Sun, Xuhui, E-mail: xhsun@suda.edu.cn, E-mail: jzhong@suda.edu.cn; Zhong, Jun, E-mail: xhsun@suda.edu.cn, E-mail: jzhong@suda.edu.cn [Soochow University-Western University Centre for Synchrotron Radiation Research, Institute of Functional Nano and Soft Materials Laboratory (FUNSOM) and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123 (China)] [Soochow University-Western University Centre for Synchrotron Radiation Research, Institute of Functional Nano and Soft Materials Laboratory (FUNSOM) and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123 (China)

2013-12-16T23:59:59.000Z

14

Photothermal imaging scanning microscopy  

DOE Patents (OSTI)

Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.

Chinn, Diane (Pleasanton, CA); Stolz, Christopher J. (Lathrop, CA); Wu, Zhouling (Pleasanton, CA); Huber, Robert (Discovery Bay, CA); Weinzapfel, Carolyn (Tracy, CA)

2006-07-11T23:59:59.000Z

15

Soft, entirely photoplastic probes for scanning force microscopy G. Genolet,a)  

E-Print Network (OSTI)

. The stiffness of a cantilever is given by its spring constant k Ewt3 /4l3 where w, t, and l denote the width with integrated tips made with a batch molding technique. II. DESCRIPTION AND FABRICATION OF PHOTOPLASTIC PROBES

Bielefeld, Universität

16

Spring Semester, Course Title: Scanned Probe Techniques  

E-Print Network (OSTI)

: a fundamental understanding of the theoretical underpinnings behind each scanned probe technique Probe Microscopy: Atomic Scale Engineering by Forces and Currents - Adam Foster and Werner Hofer Applied Scanning Probe Methods (Vol. 1-13) ­ Bharat Bhushan, ed. Springer Handbook of Nanotechnology - Bharat

Sherrill, David

17

Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy  

DOE Patents (OSTI)

An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.

Jesse, Stephen; Kalinin, Sergei V; Nikiforov, Maxim P

2013-07-09T23:59:59.000Z

18

Josephson scanning tunneling microscopy -- a local and direct probe of the superconducting order parameter  

SciTech Connect

Direct measurements of the superconducting superfluid on the surface of vacuum-cleaved Bi2Sr2CaCu2O8+delta (BSCCO) samples are reported. These measurements are accomplished via Josephson tunneling into the sample using a novel scanning tunneling microscope (STM) equipped with a superconducting tip. The spatial resolution of the STM of lateral distances less than the superconducting coherence length allows it to reveal local inhomogeneities in the pair wavefunction of the BSCCO. Instrument performance is demonstrated first with Josephson measurements of Pb films followed by the layered superconductor NbSe2. The relevant measurement parameter, the Josephson ICRN product, is discussed within the context of both BCS superconductors and the high transition temperature superconductors. The local relationship between the ICRN product and the quasiparticle density of states (DOS) gap are presented within the context of phase diagrams for BSCCO. Excessive current densities can be produced with these measurements and have been found to alter the local DOS in the BSCCO. Systematic studies of this effect were performed to determine the practical measurement limits for these experiments. Alternative methods for preparation of the BSCCO surface are also discussed.

Kimura, Hikari; Dynes, Robert; Barber Jr., Richard. P.; Ono, S.; Ando, Y.

2009-09-01T23:59:59.000Z

19

Scanning electron microscopy and electron probe microanalyses of the crystalline components of human and animal dental calculi  

SciTech Connect

A review of the use of scanning electron microscopy (SEM) and electron probe microanalyses in the study of dental calculus showed that such studies provided confirmatory and supplementary data on the morphological features of human dental calculi but gave only limited information on the identity of the crystalline or inorganic components. This study aimed to explore the potential of combined SEM and microanalyses in the identification of the crystalline components of the human and animal dental calculi. Human and animal calculi were analyzed. Identification of the crystalline components were made based on the combined information of the morphology (SEM) and Ca/P molar ratios of the crystals with the morphology and Ca/P molar ratio of synthetic calcium phosphates (brushite or DCPD; octacalcium phosphate, OCP; Mg-substituted whitlockite, beta-TCMP; CO/sub 3/-substituted apatite, (CHA); and calcite. SEM showed similarities in morphological features of human and animal dental calculi but differences in the forms of crystals present. Microanalyses and crystal morphology data suggested the presence of CaCO/sub 3/ (calcite) and CHA in the animal (cat, dog, tiger) and of OCP, beta-TCMP and CHA in human dental calculi. X-ray diffraction and infrared (IR) absorption analyses confirmed these results. This exploratory study demonstrated that by taking into consideration what is known about the crystalline components of human and animal dental calculi, combined SEM and microanalyses can provide qualitative identification.

LeGeros, R.Z.; Orly, I.; LeGeros, J.P.; Gomez, C.; Kazimiroff, J.; Tarpley, T.; Kerebel, B.

1988-03-01T23:59:59.000Z

20

Combining In-Situ Buffer-Layer-Assisted-Growth with Scanning Probe Microscopy for Formation and Study of Supported Model Catalysts  

NLE Websites -- All DOE Office Websites (Extended Search)

STM images showing the morphology of BaO film (7 ML-left and STM images showing the morphology of BaO film (7 ML-left and 80 ML-right) formed by the direct evaporation of the BaO. EMSL Research and Capability Development Proposals Combining In Situ Buffer-Layer-Assisted-Growth with Scanning Probe Microscopy for Formation and Study of Supported Model Catalysts Project start date: Spring 2008 EMSL Lead Investigator: Igor Lyubinetsky Microscopy Group, EMSL, PNNL Co-investigators: Yingge Du Spectroscopy and Diffraction Group, EMSL, PNNL Wayne Goodman Department of Chemistry, Texas A&M University, College Station, Texas The objective of the project is to implement in situ advanced buffer-layer-assisted growth (BLAG) technique by combining EMSL's ultra-high vacuum scanning probe microscopy (UHV SPM) and

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


21

Probing nanoscale photo-oxidation in organic films using spatial hole burning near-field scanning optical microscopy  

E-Print Network (OSTI)

Probing nanoscale photo-oxidation in organic films using spatial hole burning near-field scanning from a stationary NSOM tip to induce photo-oxidation. The reduction in the fluorescence yield resulting photo-oxidation as a function of time, position, and environment free from the limits of far

Buratto, Steve

22

Two-dimensional Vortex Behavior in Highly Underdoped YBa2Cu3O6 x Observed by Scanning Hall Probe Microscopy  

SciTech Connect

We report scanning Hall probe microscopy of highly underdoped superconducting YBa{sub 2}Cu{sub 3}O{sub 6+x} with T{sub c} ranging from 5 to 15 K which showed distinct flux bundles with less than one superconducting flux quantum ({Iota}{sub 0}) through the sample surface. The sub-{Iota}{sub 0} features occurred more frequently for lower T{sub c}, were more mobile than conventional vortices, and occurred more readily when the sample was cooled with an in-plane field component. We show that these features are consistent with kinked stacks of pancake vortices.

Guikema, J.W.

2010-02-22T23:59:59.000Z

23

Two-dimensional Vortex Behavior in Highly Underdoped YBa_2Cu_3O_{6+x} Observed byScanning Hall Probe Microscopy  

SciTech Connect

We report scanning Hall probe microscopy of highly underdoped superconducting YBa{sub 2}Cu{sub 3}O{sub 6+z} with T{sub c} ranging from 5 to 15 K which showed distinct flux bundles with less than one superconducting flux quantum ({Phi}{sub 0}) through the sample surface. The sub-{Phi}{sub 0} features occurred more frequently for lower T{sub c}, were more mobile than conventional vortices, and occurred more readily when the sample was cooled with an in-plane field component. We show that these features are consistent with kinked stacks of pancake vortices.

Guikema, J.W.; Bluhm, Hendrik; /Stanford U., Appl. Phys. Dept.; Bonn, D.A.; Liang, Ruixing; Hardy, W.N.; /British Columbia U.; Moler, K.A.; /Stanford U., Appl. Phys. Dept.

2008-04-22T23:59:59.000Z

24

Characterization of power induced heating and damage in fiber optic probes for near-field scanning optical microscopy  

E-Print Network (OSTI)

polymer sample are measured as a function of probe output power, as was previously reported for pulled NSOM probes. The results reveal that sample heating increases rapidly to ?5560C as output powers reach ?50nW. At higher output powers, the sample...

Dickenson, Nicholas E.; Erickson, Elizabeth S.; Mooren, Olivia L.; Dunn, Robert C.

2007-04-07T23:59:59.000Z

25

Sample heating in near-field scanning optical microscopy  

E-Print Network (OSTI)

Heating near the aperture of aluminumcoated,fiber opticnear-field scanning optical microscopy probes was studied as a function of input and output powers. Using the shear-force feedback method, near-field probes were positioned nanometers above a...

Erickson, Elizabeth S.; Dunn, Robert C.

2005-10-05T23:59:59.000Z

26

Influence of Surface Preparation on Scanning Kelvin Probe Microscopy and Electron Backscatter Diffraction Analysis of Cross Sections of CdTe/CdS Solar Cells  

SciTech Connect

Electron backscatter diffraction (EBSD) provides information on the crystallographic structure of a sample, while scanning Kelvin probe microscopy (SKPM) provides information on its electrical properties. The advantage of these techniques is their high spatial resolution, which cannot be attained with any other techniques. However, because these techniques analyze the top layers of the sample, surface or cross section features directly influence the results of the measurements, and sample preparation is a main step in the analysis. In this work we investigated different methods to prepare cross sections of CdTe/CdS solar cells for EBSD and SKPM analyses. We observed that procedures used to prepare surfaces for EBSD are not suitable to prepare cross sections, and we were able to develop a process using polishing and ion-beam milling. This process resulted in very good results and allowed us to reveal important aspects of the cross section of the CdTe films. For SKPM, polishing and a light ion-beam milling resulted in cross sections that provided good data. We were able to observe the depletion region on the CdTe film and the p-n junction as well as the interdiffusion layer between CdTe and CdS. However, preparing good-quality cross sections for SKPM is not a reproducible process, and artifacts are often observed.

Moutinho, H. R.; Dhere, R. G.; Jiang, C. S.; Al-Jassim, M. M.

2011-01-01T23:59:59.000Z

27

Development of a microfluidic device for patterning multiple species by scanning probe lithography  

E-Print Network (OSTI)

Scanning Probe Lithography (SPL) is a versatile nanofabrication platform that leverages microfluidic ink delivery systems with Scanning Probe Microscopy (SPM) for generating surface-patterned chemical functionality on the sub-100 nm length scale...

Rivas Cardona, Juan Alberto

2009-06-02T23:59:59.000Z

28

Fast scanning two-photon microscopy  

E-Print Network (OSTI)

Fast scanning two-photon microscopy coupled with the use light activated ion channels provides the basis for fast imaging and stimulation in the characterization of in vivo neural networks. A two-photon microscope capable ...

Chang, Jeremy T

2010-01-01T23:59:59.000Z

29

Atomic Force and Scanning Electron Microscopy of Atmospheric Particles  

E-Print Network (OSTI)

conducted so as to characterize atmospheric aerosols from anthropogenic (pollution) and natural (sea saltAtomic Force and Scanning Electron Microscopy of Atmospheric Particles ZAHAVA BARKAY,1 * AMIT 69978, Israel KEY WORDS atmospheric aerosols; atomic force microscopy; scanning electron microscopy

Shapira, Yoram

30

Variable Temperature Scanning Probe Microscope | EMSL  

NLE Websites -- All DOE Office Websites (Extended Search)

EMSL's ultra-high vacuum, variable-temperature scanning probe microscope system, or UHV VT SPM, is a state-of-the-art surface science tool comprising multiple complementary...

31

Scanning Probe Alloying Nanolithography (SPAN)  

E-Print Network (OSTI)

or silicon nitride. Probes shapes can be pyramidal or conical and may be sharpened. Figure 1.8. Two kinds of cantilevers; triangle and rectangle shapes. (Courtesy of PNI) 1.2.7. Mode The AFM become much more versatile and capable than before...

Lee, Hyungoo

2010-07-14T23:59:59.000Z

32

Sub-Kelvin scanning tunneling microscopy on magnetic molecules.  

E-Print Network (OSTI)

??Magnetic molecules have attracted lots interest. In this work, an ultra-stable and low noise scanning tunneling microscopy operating at 400 mK using He-3 (930 mK (more)

Zhang, Lei

2012-01-01T23:59:59.000Z

33

Reducing Photobleaching in STED Microscopy with Higher Scanning Speed  

E-Print Network (OSTI)

Photobleaching is a major limitation of super-resolution STED microscopy. We show that the photobleaching rate in STED microscopy is slowed down by scanning with a higher linear speed, enabled by the large field of view in our custom-built resonant-scanning STED microscope. The effect of scanning speed on photobleaching is more remarkable at higher levels of depletion laser irradiance. With a depletion irradiance of 0.4 GW/cm$^2$ (time average), we were able to slow down the photobleaching of the Atto 647N dye by 80% with 8-fold faster scanning. Photobleaching is primarily caused by the depletion light acting upon the excited fluorophores. Experimental data qualitatively agree with a theoretical model. Our results encourage further increasing linear scanning speed for photobleaching reduction in STED microscopy.

Wu, Yong

2014-01-01T23:59:59.000Z

34

Scanning Transmission Electron Microscopy Investigations of Complex Oxides  

NLE Websites -- All DOE Office Websites (Extended Search)

Scanning Transmission Electron Microscopy Investigations of Complex Oxides Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of Chemistry, University of South Carolina High-Angle-Annular-Dark-Field/Scanning Transmission Electron Microscopy (HAADF/STEM) is a technique uniquely suited for detailed studies of the structure and composition of complex oxides. The HAADF detector collects electrons which have interact inelastically with the potentials of the atoms in the specimen and therefore resembles the better known Z2 (Z is atomic number) Rutherford scattering. One class of important catalysts consists of bronzes based on pentagonal {Mo6O21} building units; these include Mo5O14 and Mo17O47. In the last 20 years, new materials doped with

35

Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy  

E-Print Network (OSTI)

graphene sheet (FGS) [1] can be utilized in sensor technology, batteries and supercapacitors becausePotential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy Institute of Physics. Related Articles Ferromagnetic fluctuation in doped armchair graphene nanoribbons J

Aksay, Ilhan A.

36

Atom chip microscopy: A novel probe for strongly correlated materials  

SciTech Connect

Improved measurements of strongly correlated systems will enable the predicative design of the next generation of supermaterials. In this program, we are harnessing recent advances in the quantum manipulation of ultracold atomic gases to expand our ability to probe these technologically important materials in heretofore unexplored regions of temperature, resolution, and sensitivity parameter space. We are working to demonstrate the use of atom chips to enable single-shot, large area detection of magnetic flux at the 10^-7 flux quantum level and below. By harnessing the extreme sensitivity of atomic clocks and Bose-Einstein condensates (BECs) to external perturbations, the cryogenic atom chip technology developed here will provide a magnetic flux detection capability that surpasses other techniques---such as scanning SQUIDs---by a factor of 10--1000. We are testing the utility of this technique by using rubidium BECs to image the magnetic fields emanating from charge transport and magnetic domain percolation in strongly correlated materials as they undergo temperature-tuned metal--to--insulator phase transitions. Cryogenic atom chip microscopy introduces three very important features to the toolbox of high-resolution, strongly correlated material microscopy: simultaneous detection of magnetic and electric fields (down to the sub-single electron charge level); no invasive large magnetic fields or gradients; simultaneous micro- and macroscopic spatial resolution; freedom from 1/f flicker noise at low frequencies; and, perhaps most importantly, the complete decoupling of probe and sample temperatures. The first of these features will play an important role in studying the interplay between magnetic and electric domain structure. The last two are crucial for low frequency magnetic noise detection in, e.g., the cuprate pseudogap region and for precision measurements of transport in the high temperature, technologically relevant regime inaccessible to other techniques based on superconducting scanning probes. In periods 1--3 of this grant, which we now close at the University of Illinois at Urbana-Champaign and restart at Stanford University where our new lab is being built, we have demonstrated the ability to rapidly create Rb BECs and trap them within microns of a surface ina cryostat. Period 4 of this grant, to be performed at Stanford, will demonstrate the feasibility of using atom chips with a BEC to image transport features on a cryogenically cooled surface. Successful demonstration, in future funding cycles, will lead directly to the use of system for studies of transport in exotic and technologically relevant materials such as cuprate superconductors and topological insulators.

Lev, Benjamin L

2011-11-03T23:59:59.000Z

37

Instrument Series: Microscopy Ultra-High Vacuum, Low- Temperature Scanning  

NLE Websites -- All DOE Office Websites (Extended Search)

Low- Low- Temperature Scanning Probe Microscope EMSL's ultra-high vacuum, low-temperature scanning probe microscope instrument, or UHV LT SPM, is the preeminent system dedicated to surface chemistry and physics at low temperatures down to 5 K. Operating at low temperatures provides high mechanical stability, superior vacuum conditions, and negligible drift for long-term experiments. With thermal diffusion being entirely suppressed, stable imaging becomes possible even for weakly bound species. The system is primarily used for probing single-site chemical reactivity, while the combination with a hyperthermal molecular beam allows the study of important chemical processes at energies corresponding to the operational temperatures well beyond typical UHV studies. The LT SPM provides

38

Laser scanning third-harmonic-generation microscopy in biology  

E-Print Network (OSTI)

. Denk, J. H. Stricker and W. W. Webb, "Two-photon laser scanning fluorescence microscopy," Science 248, 73-76 (1990). 3. S. Maiti, J. B. Shear, R. M. Williams, W. R. Zipfel and W. W. Webb, "Measuring-214 (1996). 6. R. Hellwarth and P. Christensen, "Nonlinear optical microscopic examination of structure

Silberberg, Yaron

39

Visualizing Macromolecular Complexes with In Situ Liquid Scanning Transmission Electron Microscopy  

SciTech Connect

A central focus of biological research is understanding the structure/function relationship of macromolecular protein complexes. Yet conventional transmission electron microscopy techniques are limited to static observations. Here we present the first direct images of purified macromolecular protein complexes using in situ liquid scanning transmission electron microscopy. Our results establish the capability of this technique for visualizing the interface between biology and nanotechnology with high fidelity while also probing the interactions of biomolecules within solution. This method represents an important advancement towards allowing future high-resolution observations of biological processes and conformational dynamics in real-time.

Evans, James E.; Jungjohann, K. L.; Wong, Peony C. K.; Chiu, Po-Lin; Dutrow, Gavin H.; Arslan, Ilke; Browning, Nigel D.

2012-11-01T23:59:59.000Z

40

Instrument Series: Microscopy Atom Probe The LEAP  

NLE Websites -- All DOE Office Websites (Extended Search)

Atom Probe Atom Probe The LEAP ® 4000 XHR local electrode atom probe tomography instrument enabled the first- ever comprehensive and accurate 3-D chemical imaging studies of low electrical conductivity materials, such as ceramics, semiconductors and oxides. The LEAP capability is assisting EMSL's efforts to further scientific advancements in interface analysis and microstructural characterization, providing a new tool for understanding the relationship between the nanoscale structure of materials and their macroscopic properties. Research Applications Geochemistry - Studying chemical processes that compose rocks and soils has long been used to determine matter cycles and transport in the environment, which supports critical EMSL research in areas including bioremediation.

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


41

Modulated microwave microscopy and probes used therewith  

DOE Patents (OSTI)

A microwave microscope including a probe tip electrode vertically positionable over a sample and projecting downwardly from the end of a cantilever. A transmission line connecting the tip electrode to the electronic control system extends along the cantilever and is separated from a ground plane at the bottom of the cantilever by a dielectric layer. The probe tip may be vertically tapped near or at the sample surface at a low frequency and the microwave signal reflected from the tip/sample interaction is demodulated at the low frequency. Alternatively, a low-frequency electrical signal is also a non-linear electrical element associated with the probe tip to non-linearly interact with the applied microwave signal and the reflected non-linear microwave signal is detected at the low frequency. The non-linear element may be semiconductor junction formed near the apex of the probe tip or be an FET formed at the base of a semiconducting tip.

Lai, Keji; Kelly, Michael; Shen, Zhi-Xun

2012-09-11T23:59:59.000Z

42

Dynamic study of tunable stiffness scanning microscope probe  

E-Print Network (OSTI)

This study examines the dynamic characteristics of the in-plane tunable stiffness scanning microscope probe for an atomic force microscope (AFM). The analysis was carried out using finite element analysis (FEA) methods for ...

Vega Gonzlez, Myraida Anglica

2005-01-01T23:59:59.000Z

43

The Scanning Theremin Microscope: A Model Scanning Probe Instrument for Hands-On Activities  

Science Journals Connector (OSTI)

(9, 10) However, we decided upon a different approach and worked with scanning probe principles to create a large-scale scanning device, the scanning theremin microscope (SThM). ... The simplest mode of scanning is to move the pantograph to scan the probe across the surface at a fixed height, listening for changes in pitch. ... We present a cascade-based computation scheme that has all of the devices and interconnects required for the one-time computation of an arbitrary logic function. ...

Rebecca C. Quardokus; Natalie A. Wasio; S. Alex Kandel

2013-12-20T23:59:59.000Z

44

Instrument Series: Microscopy Aberration-Corrected Scanning/Transmission  

NLE Websites -- All DOE Office Websites (Extended Search)

Aberration-Corrected Aberration-Corrected Scanning/Transmission Electron Microscope EMSL's aberration-corrected Titan 80-300(tm) scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials. Research Applications

45

Probing graphene defects and estimating graphene quality with optical microscopy  

SciTech Connect

We report a simple and accurate method for detecting graphene defects that utilizes the mild, dry annealing of graphene/Cu films in air. In contrast to previously reported techniques, our simple approach with optical microscopy can determine the density and degree of dislocation of defects in a graphene film without inducing water-related damage or functionalization. Scanning electron microscopy, confocal Raman and atomic force microscopy, and X-ray photoelectron spectroscopy analysis were performed to demonstrate that our nondestructive approach to characterizing graphene defects with optimized thermal annealing provides rapid and comprehensive determinations of graphene quality.

Lai, Shen [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Center for Human Interface Nanotechnology (HINT), Suwon 440-746 (Korea, Republic of); Kyu Jang, Sung [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Jae Song, Young, E-mail: yjsong@skku.edu [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Department of Physics, Sungkyunkwan University (SKKU), Suwon 440-746 (Korea, Republic of); Lee, Sungjoo, E-mail: leesj@skku.edu [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Center for Human Interface Nanotechnology (HINT), Suwon 440-746 (Korea, Republic of); College of Information and Communication Engineering, Sungkyunkwan University (SKKU), Suwon 440-746 (Korea, Republic of)

2014-01-27T23:59:59.000Z

46

Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series  

SciTech Connect

In this study, a combined tilt- and focal series is proposed as a new recording scheme for high-angle annular dark-field scanning transmission electron microscopy (STEM) tomography. Three-dimensional (3D) data were acquired by mechanically tilting the specimen, and recording a through-focal series at each tilt direction. The sample was a whole-mount macrophage cell with embedded gold nanoparticles. The tilt focal algebraic reconstruction technique (TF-ART) is introduced as a new algorithm to reconstruct tomograms from such combined tilt- and focal series. The feasibility of TF-ART was demonstrated by 3D reconstruction of the experimental 3D data. The results were compared with a conventional STEM tilt series of a similar sample. The combined tilt- and focal series led to smaller missing wedge artifacts, and a higher axial resolution than obtained for the STEM tilt series, thus improving on one of the main issues of tilt series-based electron tomography.

Dahmen, Tim [German Research Center for Artificial Intelligence (DFKI), Germany] [German Research Center for Artificial Intelligence (DFKI), Germany; Baudoin, Jean-Pierre G [ORNL] [ORNL; Lupini, Andrew R [ORNL] [ORNL; Kubel, Christian [Karlsruhe Institute of Technology, Leopoldshafen, Germany] [Karlsruhe Institute of Technology, Leopoldshafen, Germany; Slusallek, Phillip [German Research Center for Artificial Intelligence (DFKI), Germany] [German Research Center for Artificial Intelligence (DFKI), Germany; De Jonge, Niels [ORNL] [ORNL

2014-01-01T23:59:59.000Z

47

Laser-Scanning Coherent Anti-Stokes Raman Scattering Microscopy and Applications to Cell Biology  

E-Print Network (OSTI)

Laser-Scanning Coherent Anti-Stokes Raman Scattering Microscopy and Applications to Cell Biology Ji 11747-3157 USA ABSTRACT Laser-scanning coherent anti-Stokes Raman scattering (CARS) microscopy with fast., 1990). Duncan et al. constructed the first CARS microscope by use of two dye laser beams

Xie, Xiaoliang Sunney

48

ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE-EDGE SCANNING MICROSCOPY  

E-Print Network (OSTI)

ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE- EDGE SCANNING MICROSCOPY A Thesis Science #12;ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE- EDGE SCANNING MICROSCOPY A Thesis) ______________________________ ______________________________ Ergun Akleman Valerie Taylor (Member) (Head of Department) December 2003 Major Subject: Computer Science

Keyser, John

49

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

0.21.2013 0.21.2013 Scientists study old photos for new solutions to corrosion Each week, Viewpoints features interviews with guests that have expertise and real-word experience regarding specific issues. The program is aired on over 450 radio stations throughout the country. This weeks featured guests are Volker Rose, Physicist with the Advanced Photon Source and Center for Nanoscale Materials, Argonne National Laboratory, (www.anl.gov). and Edward Vicenzi, Research scientist at the Smithsonian Institution's Museum Conservation Institute, (www.si.edu/mci). Material failure caused by corrosion is dangerous and costs billions of dollars every year. What if you could figure out how to prevent and treat corrosion at the tiniest "nano" level before it has a chance to cause a

50

Atom probe field ion microscopy and related topics: A bibliography 1991  

SciTech Connect

This report contains a bibliography for 1991 on the following topics: Atom probe field ion microscopy; field desorption mass spectrometry; field emission; field ion microscopy; and field emission theory.

Russell, K.F.; Miller, M.K.

1993-01-01T23:59:59.000Z

51

Atom probe field ion microscopy and related topics: A bibliography 1992  

SciTech Connect

This bibliography contains citations of books, conference proceedings, journals, and patents published in 1992 on the following types of microscopy: atom probe field ion microscopy (108 items); field emission microscopy (101 items); and field ion microscopy (48 items). An addendum of 34 items missed in previous bibliographies is included.

Russell, K.F.; Godfrey, R.D.; Miller, M.K.

1993-12-01T23:59:59.000Z

52

Imaging and quantitative data acquisition of biological cell walls with Atomic Force Microscopy and Scanning Acoustic Microscopy  

SciTech Connect

This chapter demonstrates the feasibility of Atomic Force Microscopy (AFM) and High Frequency Scanning Acoustic Microscopy (HF-SAM) as tools to characterize biological tissues. Both the AFM and the SAM have shown to provide imaging (with different resolution) and quantitative elasticity measuring abilities. Plant cell walls with minimal disturbance and under conditions of their native state have been examined with these two kinds of microscopy. After descriptions of both the SAM and AFM, their special features and the typical sample preparation is discussed. The sample preparation is focused here on epidermal peels of onion scales and celery epidermis cells which were sectioned for the AFM to visualize the inner surface (closest to the plasma membrane) of the outer epidermal wall. The nm-wide cellulose microfibrils orientation and multilayer structure were clearly observed. The microfibril orientation and alignment tend to be more organized in older scales compared with younger scales. The onion epidermis cell wall was also used as a test analog to study cell wall elasticity by the AFM nanoindentation and the SAM V(z) feature. The novelty in this work was to demonstrate the capability of these two techniques to analyze isolated, single layered plant cell walls in their natural state. AFM nanoindentation was also used to probe the effects of Ethylenediaminetetraacetic acid (EDTA), and calcium ion treatment to modify pectin networks in cell walls. The results suggest a significant modulus increase in the calcium ion treatment and a slight decrease in EDTA treatment. To complement the AFM measurements, the HF-SAM was used to obtain the V(z) signatures of the onion epidermis. These measurements were focused on documenting the effect of pectinase enzyme treatment. The results indicate a significant change in the V(z) signature curves with time into the enzyme treatment. Thus AFM and HF-SAM open the door to a systematic nondestructive structure and mechanical property study of complex biological cell walls. A unique feature of this approach is that both microscopes allow the biological samples to be examined in their natural fluid (water) environment.

Tittmann, B. R. [Penn State; Xi, X. [Penn State

2014-09-01T23:59:59.000Z

53

In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry  

SciTech Connect

Oxides and their tailored structures are at the heart of electrochemical energy storage technologies and advances in understanding and controlling the dynamic behaviors in the complex oxides, particularly at the interfaces, during electrochemical processes will catalyze creative design concepts for new materials with enhanced and better-understood properties. Such knowledge is not accessible without new analytical tools. New innovative experimental techniques are needed for understanding the chemistry and structure of the bulk and interfaces, more importantly how they change with electrochemical processes in situ. Analytical Transmission Electron Microscopy (TEM) is used extensively to study electrode materials ex situ and is one of the most powerful tools to obtain structural, morphological, and compositional information at nanometer scale by combining imaging, diffraction and spectroscopy, e.g., EDS (energy dispersive X-ray spectrometry) and Electron Energy Loss Spectrometry (EELS). Determining the composition/structure evolution upon electrochemical cycling at the bulk and interfaces can be addressed by new electron microscopy technique with which one can observe, at the nanometer scale and in situ, the dynamic phenomena in the electrode materials. In electrochemical systems, for instance in a lithium ion battery (LIB), materials operate under conditions that are far from equilibrium, so that the materials studied ex situ may not capture the processes that occur in situ in a working battery. In situ electrochemical operation in the ultra-high vacuum column of a TEM has been pursued by two major strategies. In one strategy, a 'nano-battery' can be fabricated from an all-solid-state thin film battery using a focused ion beam (FIB). The electrolyte is either polymer based or ceramic based without any liquid component. As shown in Fig. 1a, the interfaces between the active electrode material/electrolyte can be clearly observed with TEM imaging, in contrast to the composite electrodes/electrolyte interfaces in conventional lithium ion batteries, depicted in Fig.1b, where quantitative interface characterization is extremely difficult if not impossible. A second strategy involves organic electrolyte, though this approach more closely resembles the actual operation conditions of a LIB, the extreme volatility In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry by Ying Shirley Meng, Thomas McGilvray, Ming-Che Yang, Danijel Gostovic, Feng Wang, Dongli Zeng, Yimei Zhu, and Jason Graetz of the organic electrolytes present significant challenges for designing an in situ cell that is suitable for the vacuum environment of the TEM. Significant progress has been made in the past few years on the development of in situ electron microscopy for probing nanoscale electrochemistry. In 2008, Brazier et al. reported the first cross-section observation of an all solid-state lithium ion nano-battery by TEM. In this study the FIB was used to make a 'nano-battery,' from an all solid-state battery prepared by pulsed laser deposition (PLD). In situ TEM observations were not possible at that time due to several key challenges such as the lack of a suitable biasing sample holder and vacuum transfer of sample. In 2010, Yamamoto et al. successfully observed changes of electric potential in an all-solid-state lithium ion battery in situ with electron holography (EH). The 2D potential distribution resulting from movement of lithium ions near the positive-electrode/electrolyte interface was quantified. More recently Huang et al. and Wang et al. reported the in situ observations of the electrochemical lithiation of a single SnO{sub 2} nanowire electrode in two different in situ setups. In their approach, a vacuum compatible ionic liquid is used as the electrolyte, eliminating the need for complicated membrane sealing to prevent the evaporation of carbonate based organic electrolyte into the TEM column. One main limitation of this approach is that EELS spectral imaging is not possible due to the high plasmon signal of the ionic li

Graetz J.; Meng, Y.S.; McGilvray, T.; Yang, M.-C.; Gostovic, D.; Wang, F.; Zeng, D.; Zhu, Y.

2011-10-31T23:59:59.000Z

54

Scanning photo-induced impedance microscopy*/an impedance based imaging technique  

E-Print Network (OSTI)

Scanning photo-induced impedance microscopy*/an impedance based imaging technique Steffi Krause a technique, scanning photo-induced impedance micro- scopy (SPIM), suitable for the imaging of the complex Photoelectrochemistry has been used widely to study photo-thermally induced current changes at metal surfaces

Moritz, Werner

55

Video-Rate Scanning Two-Photon Excitation Fluorescence Microscopy and Ratio Imaging with Cameleons  

E-Print Network (OSTI)

Video-Rate Scanning Two-Photon Excitation Fluorescence Microscopy and Ratio Imaging with Cameleons ABSTRACT A video-rate (30 frames/s) scanning two-photon excitation microscope has been successfully tested 690 to 1050 nm, prechirper optics for laser pulse-width compression, resonant galvanometer for video

Tsien, Roger Y.

56

Oxygen driven reconstruction dynamics of Ni,,977... measured by time-lapse scanning tunneling microscopy  

E-Print Network (OSTI)

Oxygen driven reconstruction dynamics of Ni,,977... measured by time-lapse scanning tunneling-lapse scanning tunneling microscopy STM has been used to observe the oxygen induced reconstruction behavior of Ni for the merging of steps in the presence of small amounts of adsorbed oxygen, less than 2% of a monolayer. Point

Sibener, Steven

57

Observation of diamond turned OFHC copper using Scanning Tunneling Microscopy  

SciTech Connect

Diamond turned OFHC copper samples have been observed within the past few months using the Scanning Tunneling Microscope. Initial results have shown evidence of artifacts which may be used to better understand the diamond turning process. The STM`s high resolution capability and three dimensional data representation allows observation and study of surface features unobtainable with conventional profilometry systems. Also, the STM offers a better quantitative means by which to analyze surface structures than the SEM. This paper discusses findings on several diamond turned OFHC copper samples having different cutting conditions. Each sample has been cross referenced using STM and SEM.

Grigg, D.A.; Russell, P.E.; Dow, T.A.

1988-12-01T23:59:59.000Z

58

Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy  

SciTech Connect

Gold nanoparticle films are of interest in several branches of science and technology, and accurate sample characterization is needed but technically demanding. We prepared such films by DC magnetron sputtering and recorded their mass thickness by Rutherford backscattering spectroscopy. The geometric thickness d{sub g}from the substrate to the tops of the nanoparticleswas obtained by scanning electron microscopy (SEM) combined with image analysis as well as by atomic force microscopy (AFM). The various techniques yielded an internally consistent characterization of the films. In particular, very similar results for d{sub g} were obtained by SEM with image analysis and by AFM.

Lansker, Pia C., E-mail: pia.lansaker@angstrom.uu.se; Niklasson, Gunnar A.; Granqvist, Claes G. [Department of Engineering Sciences, The ngstrm Laboratory, Uppsala University, P. O. Box 534, SE-751 21 Uppsala (Sweden); Halln, Anders [Royal Institute of Technology, KTH-ICT, Elektrum 229, Kista, SE-164 40 Stockholm (Sweden)

2014-10-15T23:59:59.000Z

59

Atomic Force Microscopy and Kelvin Probe Force Microscopy Evidence of Local Structural Inhomogeneity and Nonuniform Dopant Distribution in Conducting Polybithiophene  

Science Journals Connector (OSTI)

Atomic Force Microscopy and Kelvin Probe Force Microscopy Evidence of Local Structural Inhomogeneity and Nonuniform Dopant Distribution in Conducting Polybithiophene ... The fundamental difference between polymer grains and grain peripheral areas demonstrated by KFM was also supported by in situ contact-mode AFM data taken with the as-grown polymer film. ... (1)?Pekker, S.; Janossy, A. In Handbook of Conducting Polymers; Skotheim, T. A., Ed.; Marcel Dekker:? New York, 1986; Vol. ...

Oleg A. Semenikhin; Lei Jiang; Tomokazu Iyoda; Kazuhito Hashimoto; Akira Fujishima

1996-11-28T23:59:59.000Z

60

Method for imaging liquid and dielectric materials with scanning polarization force microscopy  

SciTech Connect

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

1999-03-09T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


61

Development of a combined interference microscope objective and scanning probe microscope  

Science Journals Connector (OSTI)

A compact sensor head combining optical interference and scanning probe microscopy in a single instrument has been developed. This instrument is able to perform complementary quantitative measurements combining fast nondestructive three-dimensional surface analysis with high lateral resolution imaging. A custom interference microscopesensor head has been designed as the optical microscope objective and integrated within the architecture of a commercial interference microscope. The combined instrument makes available both the acquisition software and the hardware interface of the commercial microscope. The latter is able to function as a phase-shift interferometer or white light interferometer. Furthermore the use of an optical fiber to transmit light from an external laser: (i) removes a major heat source from the measurement environment and (ii) makes aperture correction unnecessary. The lateral resolution of the instrument has been extended by the addition of a previously developed compact scanning probe microscope(SPM) module to the custom interference microscope objective. This SPM unit is based upon piezoresistive cantilever technology. The piezolevers are self-sensing and therefore require no additional systems such as optical beam deflection or fiber interferometry to monitor their displacement. The mechanical simplicity of the piezolever SPM unit allows for a small physical size and can thus be added to the custom optical sensor head without violating constraints on the working distance defined by the optics. A major benefit of the system in terms of a quantitative nanometrology is the possibility to perform a traceable and direct calibration of the SPM module. This calibration is achieved practically by measuring an appropriate sample at a common location using both techniques. Results are presented here for the measurement of two calibration standards and a test sample to demonstrate the increased lateral resolution of the instrument.

James W. G. Tyrrell; Claudio Dal Savio; Rolf Krger-Sehm; Hans-Ulrich Danzebrink

2004-01-01T23:59:59.000Z

62

Coal Combustion Fly Ash Characterization: Electron Spectroscopy for Chemical Analysis, Energy Dispersive X-ray Analysis, and Scanning Electron Microscopy  

Science Journals Connector (OSTI)

The surface and bulk properties of five samples of fly ash have been examined by electron spectroscopy for chemical analysis (ESCA), scanning electron microscopy (SEM) and energy...

Rothenberg, S J; Denee, P; Holloway, P

1980-01-01T23:59:59.000Z

63

Predicted scanning tunneling microscopy images of carbon nanotubes with atomic vacancies  

E-Print Network (OSTI)

Predicted scanning tunneling microscopy images of carbon nanotubes with atomic vacancies Arkady V STM images of both metallic and semiconducting single-wall carbon nanotubes with atomic vacancies predict that vacancies should result in the formation of hillock-like features in STM images of metallic

Krasheninnikov, Arkady V.

64

Fast scanning probe for tokamak plasmas J. Boedo, D. Gray, L. Chousal, and R. Conn  

E-Print Network (OSTI)

Fast scanning probe for tokamak plasmas J. Boedo, D. Gray, L. Chousal, and R. Conn Department of tokamaks. The probe described here has five tips which obtain a full spectrum of plasma parameters such as turbulence and anomalous radial particle transport.3 Understanding the tokamak boundary has pro- found

Krstic, Miroslav

65

X-ray optics for scanning fluorescence microscopy and other applications  

SciTech Connect

Scanning x-ray fluorescence microscopy is analogous to scanning electron microscopy. Maps of chemical element distribution are produced by scanning with a very small x-ray beam. Goal is to perform such scanning microscopy with resolution in the range of <1 to 10 {mu}m, using standard laboratory x-ray tubes. We are investigating mirror optics in the Kirkpatrick-Baez (K-B) configuration. K-B optics uses two curved mirrors mounted orthogonally along the optical axis. The first mirror provides vertical focus, the second mirror provides horizontal focus. We have used two types of mirrors: synthetic multilayers and crystals. Multilayer mirrors are used with lower energy radiation such as Cu K{alpha}. At higher energies such as Ag K{alpha}, silicon wafers are used in order to increase the incidence angles and thereby the photon collection efficiency. In order to increase the surface area of multilayers which reflects x-rays at the Bragg angle, we have designed mirrors with the spacing between layers graded along the optic axis in order to compensate for the changing angle of incidence. Likewise, to achieve a large reflecting surface with silicon, the wafers are placed on a specially designed lever arm which is bent into a log spiral by applying force at one end. In this way, the same diffracting angle is maintained over the entire surface of the wafer, providing a large solid angle for photon collection.

Ryon, R.W. [Lawrence Livermore National Lab., CA (United States); Warburton, W.K. [X-Ray Instrumentation Associates, Menlo Park, CA (United States)

1992-05-01T23:59:59.000Z

66

Versatile Silicon Photodiode Detector Technology for Scanning Electron Microscopy with High-Efficiency Sub-5 keV Electron Detection  

E-Print Network (OSTI)

Versatile Silicon Photodiode Detector Technology for Scanning Electron Microscopy with High for Scanning Electron Microscopy, based on ultrashallow p+ n boron-layer photodiodes, features nm-thin anodes, closely-packed photodiodes and through-wafer apertures allow flexible configurations for optimal material

Technische Universiteit Delft

67

Synthesis and structure of Al clusters supported on TiO2,,110...: A scanning tunneling microscopy study  

E-Print Network (OSTI)

Synthesis and structure of Al clusters supported on TiO2,,110...: A scanning tunneling microscopy, Texas 77843-3255 Received 14 October 1997; accepted 6 April 1998 Al clusters supported on TiO2(110) have been investigated using scanning tunneling microscopy. Al interacts strongly with the TiO2(110) surface

Goodman, Wayne

68

Study of Interactions Between Microbes and Minerals by Scanning Transmission X-Ray Microscopy (STXM)  

SciTech Connect

Scanning Transmission X-ray Microscopy (STXM) and Transmission Electron Microscopy (TEM) were combined to characterize various samples of geomicrobiological interest down to the nanometer scale. An approach based on energy-filtered imaging was used to examine microbe-mineral interactions and the resulting biominerals, as well as biosignatures in simplified laboratory samples. This approach was then applied to natural samples, including natural biofilms entombed in calcium carbonate precipitates and bioweathered silicates and facilitated location of bacterial cells and provided unique insights about their biogeochemical interactions with minerals at the 30-40 nm scale.

Benzerara, K.; /Paris U., VI-VII, LMCP; Tyliszczak, T.; /LBNL, ALS; Brown, G.E., Jr.; /Stanford U., Geo. Environ. Sci. /SLAC, SSRL

2007-01-03T23:59:59.000Z

69

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene  

E-Print Network (OSTI)

We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the energy transfer distance dependence of 14 the nitrogen-vacancy center to graphene was measured to show the predicted d-4 15 dependence. Our studies pave the way towards a diamond defect center based versatile 16 single emitter scanning microscope.

J. Tisler; T. Oeckinghaus; R. Sthr; R. Kolesov; F. Reinhard; J. Wrachtrup

2013-01-02T23:59:59.000Z

70

Electronic structure of wurtzite II-VI compound semiconductor cleavage surfaces studied by scanning tunneling microscopy  

Science Journals Connector (OSTI)

We report atomically resolved scanning tunneling microscopy (STM) images of cleavage surfaces of wurtzite II-VI compound semiconductors. CdSe(1120), CdSe(1010), and CdS(1010) were investigated. The STM images confirm a 11 reconstruction for all surfaces. At negative and positive sample voltages the occupied and empty dangling-bond states above anions and cations, respectively, dominate the contrast of the STM images. No states in the band gap were found. The electronic structure of the surface permits the observation of dopant atoms in subsurface layers and thus also cross-sectional scanning tunneling microscopy studies of point defects and heterostructures.

B. Siemens, C. Domke, Ph. Ebert, and K. Urban

1997-11-15T23:59:59.000Z

71

Examination of the cu/si(111) 55 structure by scanning tunneling microscopy  

Science Journals Connector (OSTI)

The incommensurate 55 Cu/Si(111) structure has been examined by scanning tunneling microscopy. Images show that the surface structure is not well described as a hexagonal copper layer modulated at the Si(111) periodicity. Rather, the surface breaks up into 55 subunits which pack at spacings varying from 5 to 7 lattice constants, implying that substrate-adsorbate interactions dominate lateral interactions within the Cu adlayer.

R. J. Wilson; S. Chiang; F. Salvan

1988-12-15T23:59:59.000Z

72

UNDERSTANDING THE EFFECTS OF SURFACTANT ADDITION ON RHEOLOGY USING LASER SCANNING CONFOCAL MICROSCOPY  

SciTech Connect

The effectiveness of three dispersants to modify rheology was examined using rheology measurements and laser scanning confocal microscopy (LSCM) in simulated waste solutions. All of the dispersants lowered the yield stress of the slurries below the baseline samples. The rheology curves were fitted reasonably to a Bingham Plastic model. The three-dimensional LSCM images of simulants showed distinct aggregates were greatly reduced after the addition of dispersants leading to a lowering of the yield stress of the simulated waste slurry solutions.

White, T

2007-05-08T23:59:59.000Z

73

Atom probe field ion microscopy and related topics: A bibliography 1990  

SciTech Connect

This bibliography includes references related to the following topics: atom probe field ion microscopy (APFIM), field ion microscopy (FIM), field emission (FE), ion sources, and field desorption mass microscopy (FDMM). Technique-orientated studies and applications are included. The bibliography covers the period 1990. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references, listed alphabetically by authors, are subdivided into the categories listed in paragraph one above. An Addendum of references missed in previous bibliographies is included.

Russell, K.F.; Miller, M.K.

1991-12-01T23:59:59.000Z

74

Development of a Versatile in Vitro Platform for Studying Biological Systems Using Micro-3D Printing and Scanning Electrochemical Microscopy  

Science Journals Connector (OSTI)

We report a novel strategy for studying a broad range of cellular behaviors in real time by combining two powerful analytical techniques, micro-3D printing and scanning electrochemical microscopy (SECM). This allows one, in microbiological studies, to ...

Jiyeon Kim; Jodi L. Connell; Marvin Whiteley; Allen J. Bard

2014-11-17T23:59:59.000Z

75

Microstructure development in particulate coatings examined with high-resolution cryogenic scanning electron microscopy  

SciTech Connect

The authors used cryogenic scanning electron microscopy to examine the early stages of latex film formation. They visualized the influence of ionic strength and extent of carboxylation in latex-calcium carbonate formulations and in latex-only formulations. Results demonstrated that latex particles deposited on calcium carbonate surfaces creating a suspension of carboxylic acid-stabilized calcium carbonate particles. Images of consolidation fronts showed that variation of ionic strength and extent of carboxylation dramatically changes the way latex particles consolidate and form films.

Sheehan, J.G.; Davis, H.T.; Scriven, L.E. [Univ. of Minnesota, Minneapolis, MN (United States); Takamura, Koichi [BASF Corp., Charlotte, NC (United States)

1993-12-01T23:59:59.000Z

76

Narrow band defect luminescence from Al-doped ZnO probed by scanning tunneling cathodoluminescence  

E-Print Network (OSTI)

Institute of Physics. Related Articles Effect of CdS film thickness on the photoexcited carrier lifetime of TiO2/CdS core-shell nanowires Appl. Phys. Lett. 99, 153111 (2011) Current underestimationNarrow band defect luminescence from Al-doped ZnO probed by scanning tunneling cathodoluminescence

Russell, Kasey

77

Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscope  

E-Print Network (OSTI)

experimentally shown to be conductive.8­10 However, RE metal silicide NWs are easily oxidized, so that inert NWs similarly to RE metal silicide NWs.11 It is essential to study the electrical properties, especiallyLow resistivity of Pt silicide nanowires measured using double-scanning- probe tunneling microscope

Kim, Sehun

78

EMSL: Capabilities: Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscopy Microscopy Additional Information Meet the Microscopy Experts Related EMSL User Projects Microscopy Tools are Applied to all Science Themes Watch the Microscopy capability video on EMSL's YouTube channel and read the transcript. Microscopy brochure Quiet Wing brochure EMSL hosts a variety of sophisticated microscopy instruments, including electron microscopes, optical microscopes, scanning probe microscopes, and computer-controlled microscopes for automated particle analysis. These tools are used to image a range of sample types with nanoscale-and even atomic-resolution with applications to surface, environmental, biogeochemical, atmospheric, and biological science. Each state-of-the-art instrument and customized capability is equipped with features for specific

79

The effect of patch potentials in Casimir force measurements determined by heterodyne Kelvin probe force microscopy  

E-Print Network (OSTI)

Measurements of the Casimir force require the elimination of electrostatic interactions between the surfaces. However, due to electrostatic patch potentials, the voltage required to minimize the total force may not be sufficient to completely nullify the electrostatic interaction. Thus, these surface potential variations cause an additional force, which can obscure the Casimir force signal. In this paper, we inspect the spatially varying surface potential (SP) of e-beamed, sputtered, sputtered and annealed, and template stripped gold surfaces with Heterodyne Amplitude Modulated Kelvin Probe Force Microscopy (HAM-KPFM). It is demonstrated that HAM-KPFM improves the spatial resolution of surface potential measurements compared to Amplitude Modulated Kelvin Probe Force Microscopy (AM-KPFM). We find that patch potentials vary depending on sample preparation, and that the calculated pressure can be similar to the pressure difference between Casimir force calculations employing the plasma and Drude models.

Joseph L. Garrett; David Somers; Jeremy N. Munday

2014-09-17T23:59:59.000Z

80

'Magnetoscan': a modified Hall probe scanning technique for the detection of inhomogeneities in bulk high temperature superconductors  

Science Journals Connector (OSTI)

We present a novel technique for the investigation of local variations of the critical current density in large bulk superconductors. In contrast to the usual Hall probe scanning technique, the sample is not magnetized as a whole before the scan, but locally by a small permanent magnet, which is fixed near the Hall probe, during the scanning process. The resulting signal can be interpreted as a qualitative measure of the local shielding currents flowing at the surface.

M Eisterer; S Haindl; T Wojcik; H W Weber

2003-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


81

Imaging and microanalysis of thin ionomer layers by scanning transmission electron microscopy  

SciTech Connect

Improved conditions for imaging and spectroscopic mapping of thin perfluorosulfonic acid (PFSA) ionomer layers in fuel cell electrodes by scanning transmission electron microscopy (STEM) have been investigated. These conditions are first identified on model systems of Nafion ionomer-coated nanostructured thin films and nanoporous Si. The optimized conditions are then applied in a quantitative study of the ionomer through-layer loading for two typical electrode catalyst coatings using electron energy loss and energy dispersive X-ray spectroscopy in the transmission electron microscope. The e-beam induced damage to the perfluorosulfonic acid (PFSA) ionomer is quantified by following the fluorine mass loss with electron exposure and is then mitigated by a few orders of magnitude using cryogenic specimen cooling and a higher incident electron voltage. Multivariate statistical analysis is also applied to the analysis of spectrum images for data denoising and unbiased separation of independent components related to the catalyst, ionomer, and support.

Cullen, David A [ORNL; Koestner, Roland [General Motors Corporation; Kukreja, Ratan [General Motors Corporation; Minko, Sergiy [Clarkson University, Potsdam, NY; Trotsenko, Oleksandr [Clarkson University, Potsdam, NY; Tokarev, Alexander V [ORNL; Guetaz, Laure [French Atomic Energy Commission (CEA), Grenoble; Meyer III, Harry M [ORNL; Parish, Chad M [ORNL; More, Karren Leslie [ORNL

2014-01-01T23:59:59.000Z

82

Difference of operation mechanisms in SWNTs network FETs studied via scanning gate microscopy  

SciTech Connect

Field effect transistors (FETs) whose channel is composed of a network of single wall carbon nanotubes (SWNTs) have been studied to investigate the mechanism of the device operation via scanning gate microscopy (SGM) at room temperature. We observed different SGM response in networks of SWNTs either synthesized by CoMoCAT process or semiconducting enriched by density gradient ultracentrifuge process. In the former case, SGM response was observed at specific inter-tube junctions suggesting a Schottky junction formed with semiconducting and metallic SWNTs in the network. In contrast, multiple concentric rings in the SGM response are observed within the tubes in a network of the latter SWNTs suggesting a possibility of quantum mechanical transport at room-temperature. Different type of SGM responses are confirmed in the two kinds of SWNTs networks, nevertheless such active positions would likely have an important role in the FET operation mechanism in each network.

Wei, Xiaojun; Matsunaga, Masahiro; Yahagi, Tatsurou; Maeda, Kenji; Ochiai, Yuichi; Aoki, Nobuyuki [Graduate School of Advanced Integration Science, Chiba University, Chiba 263-8522 (Japan); Bird, Jonathan P. [Department of Electrical Engineering, University at Buffalo, the State University of New York, Buffalo, NY 14260-1920 (United States); Ishibashi, Koji [Advanced Device Laboratory, RIKEN, Wako, Saitama 351-0198 (Japan)

2013-12-04T23:59:59.000Z

83

Quantitative determination of local potential values in inhomogeneously doped semiconductors by scanning tunneling microscopy  

Science Journals Connector (OSTI)

Local potential changes arising from nanoscale three-dimensional spatial fluctuations in the dopant distribution in Zn-doped GaAs were investigated quantitatively by scanning tunneling microscopy and spectroscopy at (110) cleavage surfaces. Tunneling spectra measured in areas with different local doping concentration show apparent shifts of the valence band edge and apparent changes of the band gap. A quantitative analysis, combined with band bending and tunnel current simulations, demonstrates that these effects arise from tip-induced band bending that modulates the real potential changes. It is illustrated how exact potential changes between locally high and low doped areas can be determined. It is found that the local potential fluctuations in three-dimensionally doped semiconductors are approximately one order of magnitude smaller that those observed in two-dimensionally doped semiconductors.

P. H. Weidlich, R. E. Dunin-Borkowski, and Ph. Ebert

2011-08-29T23:59:59.000Z

84

Nanoscale chemical imaging using synchrotron x-ray enhanced scanning tunneling microscopy  

SciTech Connect

The combination of synchrotron radiation with scanning tunneling microscopy provides a promising new concept for chemical imaging of nanoscale structures. It employs detection of local x-ray absorption, which directly yields chemical, electronic, and magnetic sensitivity. The study of the tip current in the far field (800 nm tip/sample separation) shows that insulator-coated tips have to be considered in order to reduce the background from stray photoelectron. A picture of the different channels contributing to the x-ray enhanced STM process is proposed. If during electron tunneling the sample is illuminated with monochromatic x-rays, characteristic absorption will arise, and core electrons are excited, which might modulate the conventional tunnel current and facilitate chemical imaging at the nanoscale.

Rose, Volker; Freeland, John W. [Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

2010-06-23T23:59:59.000Z

85

Dual harmonic Kelvin probe force microscopy at the grapheneliquid interface  

SciTech Connect

Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions. However, for many energy storage and conversion systems, including graphene-based electrochemical capacitors, understanding electrochemical phenomena at the solidliquid interface is paramount. Despite the vast potential to provide fundamental insight for energy storage materials at the nanoscale, KPFM has found limited applicability in liquid environments to date. Here, using dual harmonic (DH)-KPFM, we demonstrate CPD imaging of graphene in liquid. We find good agreement with measurements performed in air, highlighting the potential of DH-KPFM to probe electrochemistry at the grapheneliquid interface.

Collins, Liam; Rodriguez, Brian J., E-mail: brian.rodriguez@ucd.ie [School of Physics, University College Dublin, Belfield, Dublin 4 (Ireland); Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4 (Ireland); Kilpatrick, Jason I.; Weber, Stefan A. L. [Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4 (Ireland); Vlassiouk, Ivan V. [Energy and Transportation Science Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Tselev, Alexander; Jesse, Stephen; Kalinin, Sergei V. [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

2014-03-31T23:59:59.000Z

86

A flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid interface  

E-Print Network (OSTI)

low-noise measurements in ambient, in situ, and electrochemical environments. II. DESIGNA flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid interface, specifically in electrolyte environments. Quantification of system noise limits

Gimzewski, James

87

Scanning tunneling microscope tip as a positionable contact: Probing a Josephson-junction array at subkelvin temperatures  

E-Print Network (OSTI)

Scanning tunneling microscope tip as a positionable contact: Probing a Josephson-junction arrayK. The STM enables us to probe the structure, a Josephson-junction array, at various positions. Examples of such systems are two- dimensional electron gases and Josephson junction arrays.1

88

Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis  

E-Print Network (OSTI)

Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy Studies of magnetic domain distributions in patterned magnetic materials are of pivotal importance in the areas of ultrahigh density magnetic recording, MRAM design, and miniaturized magnetic sensor arrays

Rau, Carl

89

Graphene on Ru(0001) Moire Corrugation Studied by Scanning Tunneling Microscopy on Au/Graphene/Ru(0001) Heterostructures  

E-Print Network (OSTI)

Graphene on Ru(0001) Moire Corrugation Studied by Scanning Tunneling Microscopy on Au/Graphene on graphene/Ru(0001) were used to study the corrugation of the moire structure of graphene/Ru(0001 for the graphene/Ru(0001) moire is of structural nature rather than electronic. STM showed a large value

Ciobanu, Cristian

90

Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy  

SciTech Connect

Observation of growth, synthesis, dynamics and electrochemical reactions in the liquid state is an important yet largely unstudied aspect of nanotechnology. The only techniques that can potentially provide the insights necessary to advance our understanding of these mechanisms is simultaneous atomic-scale imaging and quantitative chemical analysis (through spectroscopy) under environmental conditions in the transmission electron microscope (TEM). In this study we describe the experimental and technical conditions necessary to obtain electron energy loss (EEL) spectra from a nanoparticle in colloidal suspension using aberration corrected scanning transmission electron microscopy (STEM) combined with the environmental liquid stage. At a fluid path length below 400 nm, atomic resolution images can be obtained and simultaneous compositional analysis can be achieved. We show that EEL spectroscopy can be used to quantify the total fluid path length around the nanoparticle, and demonstrate characteristic core-loss signals from the suspended nanoparticles can be resolved and analyzed to provide information on the local interfacial chemistry with the surrounding environment. The combined approach using aberration corrected STEM and EEL spectra with the in situ fluid stage demonstrates a plenary platform for detailed investigations of solution based catalysis and biological research.

Jungjohann, K. L.; Evans, James E.; Aguiar, Jeff; Arslan, Ilke; Browning, Nigel D.

2012-06-04T23:59:59.000Z

91

Scanning tunneling microscopy study of nitrogen incorporated HfO{sub 2}  

SciTech Connect

The impact of nitrogen incorporation on the physical and electrical characteristics of the HfO{sub 2} is examined. X-ray photoelectron spectroscopy shows that nitrogen can be incorporated into the HfO{sub 2} via a two-step thermal anneal--first in ultrahigh vacuum (UHV) and subsequently in N{sub 2}. Following the N{sub 2} anneal, scanning tunneling microscopy in UHV reveals a marked reduction in the low-voltage leakage current under gate injection biasing. From band theory and existing first-principles simulation results, one may consistently attribute this improvement to the passivation of oxygen vacancies in the HfO{sub 2} by nitrogen. Improvement in the breakdown strength of the HfO{sub 2} subjected to ramp-voltage stress (substrate injection) is also observed after the N{sub 2} anneal. The local current-voltage curves acquired concurrently during the ramp-voltage stress exhibit 'space-charge limited conduction', which implies that the observed improvement in breakdown strength may be related to a limitation of the current flow through the gate stack in the high stress voltage regime.

Ong, Y. C.; Ang, D. S.; Pey, K. L.; Li, X. [Nanyang Technological University, School of Electrical and Electronic Engineering, Nanyang Avenue, Singapore 639798 (Singapore); O'Shea, S. J.; Wang, S. J. [Institute of Materials Research and Engineering, A-STAR - Agency for Science, Technology and Research, 3 Research Link, Singapore 11760 (Singapore); Tung, C. H. [Institute of Microelectronics, A-STAR - Agency for Science, Technology and Research, 11 Science Park Road, Singapore Science Park II, Singapore 117685 (Singapore)

2008-09-15T23:59:59.000Z

92

Geochemistry Atomic Force Microscopy | EMSL  

NLE Websites -- All DOE Office Websites (Extended Search)

imaging modes: contact, intermittent contact, phase imaging, magnetic force microscopy, electric force microscopy, surface potential microscopy, scanning capacitance microscopy,...

93

SCANNING ELECTRON MICROSCOPY AND X-RAY DIFFRACTION ANALYSIS OF TANK 18 SAMPLES  

SciTech Connect

The F-Area Tank Farm (FTF) Performance Assessment (PA) utilizes waste speciation in the waste release model used in the FTF fate and transport modeling. The waste release modeling associated with the residual plutonium in Tank 18 has been identified as a primary contributor to the Tank 18 dose uncertainty. In order to reduce the uncertainty related to plutonium in Tank 18, a better understanding of the plutonium speciation in the Tank 18 waste (including the oxidation state and stoichiometry) is desired. Savannah River National Laboratory (SRNL) utilized Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to analyze Tank 18 samples to provide information on the speciation of plutonium in the waste material. XRD analysis of the Tank 18 samples did not identify any plutonium mineral phases in the samples. These indicates the crystalline mineral phases of plutonium are below the detection limits of the XRD method or that the plutonium phase(s) lack long range order and are present as amorphous or microcrystalline solids. SEM analysis of the Tank 18 samples did locate particles containing plutonium. The plutonium was found as small particles, usually <1 {micro}m but ranging up to several micrometers in diameter, associated with particles of an iron matrix and at low concentration in other elemental matrices. This suggests the plutonium has an affinity for the iron matrix. Qualitatively, the particles of plutonium found in the SEM analysis do not appear to account for all of the plutonium in the sample based on concentrations determined from the chemical analysis of the Tank 18 samples. This suggests that plutonium is also distributed throughout the solids in low concentrations.

Hay, M.; O'Rourke, P.; Ajo, H.

2012-03-08T23:59:59.000Z

94

Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review  

E-Print Network (OSTI)

We review our recent developments of near-field scanning optical microscopy (NSOM) that uses an active tip made of a single fluorescent nanodiamond (ND) grafted onto the apex of a substrate fiber tip. The ND hosting a limited number of nitrogen-vacancy (NV) color centers, such a tip is a scanning quantum source of light. The method for preparing the ND-based tips and their basic properties are summarized. Then we discuss theoretically the concept of spatial resolution that is achievable in this special NSOM configuration and find it to be only limited by the scan height over the imaged system, in contrast with the standard aperture-tip NSOM whose resolution depends critically on both the scan height and aperture diameter. Finally, we describe a scheme we have introduced recently for high-resolution imaging of nanoplasmonic structures with ND-based tips that is capable of approaching the ultimate resolution anticipated by theory.

Drezet, A; Cuche, A; Mollet, O; Berthel, M; Huant, S

2015-01-01T23:59:59.000Z

95

Highly controlled fabrication of carbon nanotube based probes for atomic force microscopy  

E-Print Network (OSTI)

phase images taken with the CNC MFM probe. 5.7 References J.silicon substrate using (a) A CNC probe. (b) A commercial Sithe Si MFM probe, and (b) the CNC MFM probe ... . 94

Chen, I-Chen

2007-01-01T23:59:59.000Z

96

Measurement of semiconductor local carrier concentration from displacement current-voltage curves with a scanning vibrating probe  

Science Journals Connector (OSTI)

A theoretical equation has been fitted to displacement current-voltage curves of semiconductor in order to obtain the local carrier concentration of the semiconductor. The distance between a semiconductor surface and a scanning probe is changed sinusoidally and is adjusted as small as a few nm at which tunneling current flows. Displacement current due to the change in electric flux from the semiconductor surface to the scanning probe flows periodically in accordance with the vibration of the scanning probe, and it is separated from tunneling current using a two-phase lock-in amplifier. The displacement current-probe voltage curve is analyzed by taking into account two-dimensional electric flux profile from the semiconductor surface. It is realized that the lateral resolution of the displacement current depends on the probe voltage and that it is between one-eighth and one-fifteenth smaller than the top radius of the probe since the depletion-layer width of the semiconductor is determined by the probe voltage, the distance, and the carrier concentration. The theoretical displacement current-voltage curves are in good agreement with the measurement in both voltage regions where the majority carriers are accumulated and depleted. The local carrier concentration can be determined by fitting the theoretical displacement current-voltage curve with the experimental results.

Yutaka Majima; Yutaka Oyama; Mitsumasa Iwamoto

2000-07-15T23:59:59.000Z

97

A calibration method for lateral forces for use with colloidal probe force microscopy cantilevers  

SciTech Connect

A calibration method is described for colloidal probe cantilevers that enables friction force measurements obtained using lateral force microscopy (LFM) to be quantified. The method is an adaptation of the lever method of Feiler et al. [A. Feiler, P. Attard, and I. Larson, Rev. Sci. Instum. 71, 2746 (2000)] and uses the advantageous positioning of probe particles that are usually offset from the central axis of the cantilever. The main sources of error in the calibration method are assessed, in particular, the potential misalignment of the long axis of the cantilever that ideally should be perpendicular to the photodiode detector. When this is not taken into account, the misalignment is shown to have a significant effect on the cantilever torsional stiffness but not on the lateral photodiode sensitivity. Also, because the friction signal is affected by the topography of the substrate, the method presented is valid only against flat substrates. Two types of particles, 20 {mu}m glass beads and UO{sub 3} agglomerates attached to silicon tapping mode cantilevers were used to test the method against substrates including glass, cleaved mica, and UO{sub 2} single crystals. Comparisons with the lateral compliance method of Cain et al. [R. G. Cain, S. Biggs, and N. W. Page, J. Colloid Interface Sci. 227, 55 (2000)] are also made.

Quintanilla, M. A. S.; Goddard, D. T. [Nexia Solutions Ltd., Springfields, Salwick, Preston, Lancashire PR4 0XJ (United Kingdom)

2008-02-15T23:59:59.000Z

98

Low-temperature scanning tunneling microscopy and transport measurements on adsorbate-induced two-dimensional electron systems  

SciTech Connect

We have performed not only magnetotransport measurements on two-dimensional electron systems (2DESs) formed at the cleaved surfaces of p-InAs but also observations of the surface morphology of the adsorbate atoms, which induced the 2DES at the surfaces of narrow band-gap semiconductors, with use of a scanning tunneling microscopy. The electron density of the 2DESs is compared to the atomic density of the isolated Ag adatoms on InAs surfaces.

Masutomi, Ryuichi; Triyama, Naotaka; Okamoto, Tohru [Department of Physics, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

2013-12-04T23:59:59.000Z

99

Electronic properties of the Ga vacancy in GaP(110) surfaces determined by scanning tunneling microscopy  

Science Journals Connector (OSTI)

The electronic properties of uncharged Ga monovacancies in GaP(110) surfaces are determined from voltage-dependent scanning tunneling microscopy images. The signatures of localized defect states in the band gap are analyzed and their spatial location is determined. Empty and occupied defect states exist. Depressed dangling bonds in the occupied-state images indicate an inward relaxation of the neighboring P atoms. The results agree with recent theoretical work.

Ph. Ebert and K. Urban

1998-07-15T23:59:59.000Z

100

Advances in experimental technique for quantitative two-dimensional dopant profiling by scanning capacitance microscopy  

Science Journals Connector (OSTI)

Several advances have been made toward the achievement of quantitative two-dimensional dopant and carrier profiling. To improve the dielectric and charge properties of the oxidesilicon interface a method of low temperature heat treatment has been developed which produces an insulating layer with consistent quality and reproducibility. After a standard polishing procedure is applied to cross-sectional samples the samples are heated to 300?C for 30 min under ultraviolet illumination. This additional surface treatment dramatically improves dielectric layer uniformity scanning capacitancemicroscopy (SCM) signal to noise ratio and CV curve flat band offset. Examples of the improvement in the surface quality and comparisons of converted SCM data with secondary ion mass spectrometry(SIMS) data are shown. A SCM tip study has also been performed that indicates significant tip depletion problems can occur. It is shown that dopedsilicon tips are often depleted by the applied SCM bias voltage causing errors in the SCM measured profile. Worn metalcoated and silicided silicon tips also can cause similar problems. When these effects are tested for and eliminated excellent agreement can be achieved between quantitative SCM profiles and SIMS data over a five-decade range of dopant density using a proper physical model. The impact of the tip size and shape on SCM spatial accuracy is simulated. A flat tip model gives a good agreement with experimental data. It is found that the dc offset used to compensate the CV curve flat band shift has a consistently opposite sign on p- and n-type substrates. This corresponds to a positive surface on p-type silicon and to a negative surface on n-type silicon. Rectification of the large capacitance probing voltage is considered as a mechanism responsible for the apparent flat band shift of (0.41) V measured on the samples after heating under UV irradiation. To explain the larger flat band shift of (15) V tip induced charging of water-related traps is proposed and discussed.

V. V. Zavyalov; J. S. McMurray; C. C. Williams

1999-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


101

Scanning Hall Probe Imaging of ErNi2B2C  

SciTech Connect

We report scanning Hall probe imaging of ErNi{sub 2}B{sub 2}C in the superconducting, antiferromagnetic, and weakly ferromagnetic regimes in magnetic fields up to 20 Oe, well below H{sub c1}, with two results. First, imaging isolated vortices shows that they spontaneously rearrange on cooling through the antiferromagnetic transition temperature T{sub N} = 6 K to pin on twin boundaries, forming a striped pattern. Second, a weak, random magnetic signal appears in the ferromagnetic phase below T{sub WFM} = 2.3 K, and no spontaneous vortex lattice is present down to 1.9 K. We conclude that ferromagnetism coexists with superconductivity either by forming small ferromagnetic domains or with oscillatory variation of the magnetization on sub-penetration depth length scales.

Bluhm, Hendrik; Sebastian, Suchitra; Guikema, Janice W.; Fisher, I.R.; Moler, Kathryn A.; /Stanford U., Appl. Phys. Dept.

2005-12-02T23:59:59.000Z

102

Platelet Adhesion in Rabbit Arteries observed by Scanning and Transmission Electron Microscopy  

Science Journals Connector (OSTI)

... the endothelium is removed from the mid-abdominal aorta of a rabbit, by passing a roughened probe into the lumen, only single platelets or small platelet clumps adhere to the ...

B. L. SHEPPARD; J. E. FRENCH

1970-03-14T23:59:59.000Z

103

Recent advances in electron imaging, image interpretation and applications: environmental scanning electron microscopy  

Science Journals Connector (OSTI)

...A treatment of the physics governing this phenomenon...electron microscopy, the physics of which provides much...Varaprasad, L. H. 1991 Handbook of optical constants...ed.) 1991 CRC handbook of chemistry and physics. Boca Raton, FL...

2003-01-01T23:59:59.000Z

104

Microstructural development in PWA-1480 electron beam welds: An atom probe field ion microscopy study  

SciTech Connect

The microstructure development in PWA-1480 superalloy electron beam weld (Ni-11.0 at. % Al-11.5% Cr-1.9% Ti-5.1% Co-4.0% Ta-1.3% W) was characterized. Optical microscopy revealed a branched dendritic structure in the weld metal. Transmission electron microscopy of these welds, in the as-welded condition, showed fine cuboidal (0.05--0.5 {mu}m) L1{sub 2}-ordered {gamma}{prime} precipitates within the y grains. The average volume percentage of {gamma}{prime} precipitates was found to be {approx}5%. Atom probe analyses revealed that the composition of {gamma} matrix was Ni-4.6 at. % Al-25.5% Cr-0.4% Ti-9.4% Co-0.8% Ta-2.9% W and that of {gamma}{prime} precipitates was Ni-17.3 at. % Al-2.6% Cr-2.4% Ti-3.0% Co-7.4% Ta-1.3% W. These compositions were compared with the previous APFIM analyses of commercial PWA-1480 single crystals that had received conventional heat treatments. Small differences were found in the chromium and aluminum levels and these may be due to the nonequilibrium nature of phase transformations that occur during weld cooling. No solute segregation was detected at the {gamma}-{gamma}{prime}interface. The APFIM results were also compared with the thermodynamic calculations of alloying element partitioning between {gamma} and {gamma}{prime} using the ThermoCalc{trademark} software.

David, S.A.; Miller, M.K. [Oak Ridge National Lab., TN (United States); Babu, S.S. [The Pennsylvania State Univ., State College, PA (United States)

1995-12-31T23:59:59.000Z

105

Electrical Characterization of Transition Metal Silicide Nanostructures Using Variable Temperature Scanning Probe Microscopy.  

E-Print Network (OSTI)

??Cobalt disilicide (CoSi2) islands have been formed on Si(111) and Si(100) through UHV deposition and annealing. Current-voltage (I-V) and temperature-dependent current-voltage (I-V-T) curves have been (more)

Tedesco, Joseph Leo

2007-01-01T23:59:59.000Z

106

Thermally driven visco-elastic measurement technique via spectral variations in scanning probe microscopy cantilevers  

E-Print Network (OSTI)

Understanding how fluids respond to various deformations is of great importance to a spectrum of disciplines ranging from bio-medical research on joint replacements to sealing technology in industrial machinery. Specifically, ...

Jones, Ryan Edward, 1974-

2004-01-01T23:59:59.000Z

107

Proximal Probes | Center for Functional Nanomaterials  

NLE Websites -- All DOE Office Websites (Extended Search)

Proximal Probes Facility Proximal Probes Facility proximal probes The Proximal Probes Facility consists of laboratories for microscopy, spectroscopy, and probing of nanostructured materials and their functional properties. At the core of the facility is a suite of instruments for in-situ microscopy of surfaces and nanostructures under extreme conditions, e.g., in reactive gases, and at high or low temperatures. Unique instruments enable in-situ and in-operando studies of surface chemistry and catalysis at pressures from ultrahigh vacuum (UHV) to 5 bar via complementary scanning tunneling microscopy imaging and photoelectron spectroscopy, coupled with real-time gas analysis. Several UHV systems are available for scanning tunneling and atomic force microscopy, as well as low-energy electron microscopy and synchrotron photoelectron microscopy. A

108

Scanning-tunneling-microscopy studies of disilane adsorption and pyrolytic growth on Si(100)-(2x1)  

SciTech Connect

Scanning tunneling microscopy has been employed to study the adsorption of disilane (Si{sub 2}H{sub 6}) and pyrolytic growth on Si(100)-(2{times}1) at various temperatures. Room-temperature exposures result in a random distribution of dissociation fragments on the surface. Formation of anisotropic monohydride islands and denuded zones as well as island coarsening is observed at higher temperatures. The results are strikingly similar to those reported for growth by molecular-beam epitaxy using pure Si, even though different surface reactions are involved in these two growth processes.

Lin, D.; Hirschorn, E.S.; Chiang, T. (Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)); Tsu, R.; Lubben, D.; Greene, J.E. (Department of Materials Science, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States) Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States))

1992-02-15T23:59:59.000Z

109

Surface [4 + 2] Cycloaddition Reaction of Thymine on Si(111)77 Observed by Scanning Tunneling Microscopy  

Science Journals Connector (OSTI)

WATLab and Department of Chemistry, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada ... Simple hydrocarbons(1) with aliphatic chain backbones, alkenes, alkynes, and aromatic molecules without and with heteroatoms(3) have been investigated by a number of experimental methods, including X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), high-resolution electron energy loss spectroscopy (HREELS), and scanning tunneling microscopy (STM) as well as computational methods based on density functional theory (DFT), MollerPlesset perturbation theory (MP2), and semiempirical techniques. ...

A. Chatterjee; L. Zhang; K. T. Leung

2013-06-21T23:59:59.000Z

110

Investigating the Optical Properties of Dislocations by Scanning Transmission Electron Microscopy  

E-Print Network (OSTI)

investigation for solid-state lighting and display applications, and dislocations are known to be nonradiative the radiative pathway and contribute to the enormous savings in energy use and greenhouse gas emissions expected with efficient solid-state lighting. CL Studies of Dislocations One of the key advantages of a scanning micro

Pennycook, Steve

111

Direct determination of exact charge states of surface point defects using scanning tunneling microscopy: As vacancies on GaAs ,,110...  

E-Print Network (OSTI)

microscopy: As vacancies on GaAs ,,110... Kuo-Jen Chao, Arthur R. Smith, and Chih-Kang Shih* Department of the charge state of surface As vacancies on p-type GaAs 110 using scanning tunneling microscopy. This method utilizes the compensation between the local band bending result- ing from the As vacancy and the p

112

Deformation induced changes in surface properties of polymers investigated by scanning force microscopy  

E-Print Network (OSTI)

In this study the possibility of combining commercial Scanning Force Microscopes (SFM) with stretching devices for the investigation of microscopic surface changes during stepwise elongation is investigated. Different types of stretching devices have been developed either for Scanning Platform-SFM or for Stand Alone-SFM. Their suitability for the investigation of deformation induced surface changes is demonstrated. A uniaxially oriented polypropylene film is stretched vertically to its extrusion direction. The reorientation of its microfibrillar structure is investigated and correlated to macroscopic structural changes determined by taking a force-elongation curve. Microtome cuts of natural rubber filled with 15 PHR carbon black are stretched. Changes in topography, local stiffness and adhesive force are simultaneously reported by using a new imaging method called Pulsed Force Mode (PFM).

Sabine Hild; Armin Rosa; Othmar Marti

2013-12-10T23:59:59.000Z

113

Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy  

DOE Patents (OSTI)

A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

Kazmerski, Lawrence L. (Lakewood, CO)

1990-01-01T23:59:59.000Z

114

Acquisition and reconstruction of brain tissue using knife-edge scanning microscopy  

E-Print Network (OSTI)

. As the sample passes under an individual photon receptor, the light intensity value is summed and passed to the next register. The final output pixel is the sum of the light intensity received by all TDI registers for a single sampled point... wide line is imaged along the leading edge of the knife. Our primary camera of choice is a DALSA CT-F3 High- Speed TDI Line Scan Camera. In order to get a high sensitivity at the speed at which we want to cut, the monochrome camera uses Time Delay...

Mayerich, David Matthew

2004-09-30T23:59:59.000Z

115

A diamond-based scanning probe spin sensor operating at low temperature in ultra-high vacuum  

SciTech Connect

We present the design and performance of an ultra-high vacuum (UHV) low temperature scanning probe microscope employing the nitrogen-vacancy color center in diamond as an ultrasensitive magnetic field sensor. Using this center as an atomic-size scanning probe has enabled imaging of nanoscale magnetic fields and single spins under ambient conditions. In this article we describe an experimental setup to operate this sensor in a cryogenic UHV environment. This will extend the applicability to a variety of molecular systems due to the enhanced target spin lifetimes at low temperature and the controlled sample preparation under UHV conditions. The instrument combines a tuning-fork based atomic force microscope (AFM) with a high numeric aperture confocal microscope and the facilities for application of radio-frequency (RF) fields for spin manipulation. We verify a sample temperature of <50 K even for strong laser and RF excitation and demonstrate magnetic resonance imaging with a magnetic AFM tip.

Schaefer-Nolte, E.; Wrachtrup, J. [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany) [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany); 3rd Institute of Physics and Research Center SCoPE, University Stuttgart, 70569 Stuttgart (Germany); Reinhard, F. [3rd Institute of Physics and Research Center SCoPE, University Stuttgart, 70569 Stuttgart (Germany)] [3rd Institute of Physics and Research Center SCoPE, University Stuttgart, 70569 Stuttgart (Germany); Ternes, M., E-mail: m.ternes@fkf.mpg.de [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany); Kern, K. [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany) [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany); Institut de Physique de la Matire Condense, Ecole Polytechnique Fdrale de Lausanne, 1015 Lausanne (Switzerland)

2014-01-15T23:59:59.000Z

116

Iran Thomas Auditorium, 8600 Transport Measurements by Scanning...  

NLE Websites -- All DOE Office Websites (Extended Search)

8600 Transport Measurements by Scanning Probe Microscopy: Possibilities for Graphene Randall M. Feenstra Department of Physics Carnegie Mellon University CNMS D D I I S S C C O O...

117

Three-Dimensional Aberration-Corrected Scanning Transmission Electron Microscopy for Biology  

SciTech Connect

Recent instrumental developments have enabled greatly improved resolution of scanning transmission electron microscopes (STEM) through aberration correction. An additional and previously unanticipated advantage of aberration correction is the greatly improved depth sensitivity that has led to the reconstruction of a three-dimensional (3D) image from a focal series. In this chapter the potential of aberration-corrected 3D STEM to provide major improvements in the imaging capabilities for biological samples will be discussed. This chapter contains a brief overview ofthe various high-resolution 3D imaging techniques, a historical perspective of the development of STEM, first estimates of the dose-limited axial and lateral resolution on biological samples and initial experiments on stained thin sections.

De Jonge, Niels [ORNL; Sougrat, Rachid [ORNL; Pennycook, Stephen J [ORNL; Peckys, Diana B [ORNL; Lupini, Andrew R [ORNL

2007-01-01T23:59:59.000Z

118

Widely tuneable scattering-type scanning near-field optical microscopy using pulsed quantum cascade lasers  

SciTech Connect

We demonstrate the use of a pulsed quantum cascade laser, wavelength tuneable between 6 and 10??m, with a scattering-type scanning near-field optical microscope (s-SNOM). A simple method for calculating the signal-to-noise ratio (SNR) of the s-SNOM measurement is presented. For pulsed lasers, the SNR is shown to be highly dependent on the degree of synchronization between the laser pulse and the sampling circuitry; in measurements on a gold sample, the SNR is 26 with good synchronization and less than 1 without. Simulations and experimental s-SNOM images, with a resolution of 100?nm, corresponding to ?/80, and an acquisition time of less than 90 s, are presented as proof of concept. They show the change in the field profile of plasmon-resonant broadband antennas when they are excited with wavelengths of 7.9 and 9.5??m.

Yoxall, Edward, E-mail: edward.yoxall@imperial.ac.uk; Rahmani, Mohsen; Maier, Stefan A.; Phillips, Chris C. [The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ (United Kingdom)] [The Blackett Laboratory, Department of Physics, Imperial College London, London SW7 2AZ (United Kingdom); Navarro-Ca, Miguel [Optical and Semiconductor Devices Group, Department of Electrical and Electronic Engineering, Imperial College London, London SW7 2BT (United Kingdom)] [Optical and Semiconductor Devices Group, Department of Electrical and Electronic Engineering, Imperial College London, London SW7 2BT (United Kingdom)

2013-11-18T23:59:59.000Z

119

Understanding Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic Resolution Electron Microscopy and Field Evaporation Simulation  

SciTech Connect

Metal-dielectric composite materials, specifically metal nanoparticles supported on or embedded in metal oxides, are widely used in catalysis. The accurate optimization of such nanostructures warrants the need for detailed three-dimensional characterization. Atom probe tomography is uniquely capable of generating sub-nanometer structural and compositional data with part-per-million mass sensitivity, but there are reconstruction artifacts for composites containing materials with strongly differing fields of evaporation, as for oxide-supported metal nanoparticles. By correlating atom probe tomography with scanning transmission electron microscopy for Au nanoparticles embedded in an MgO support, deviations from an ideal topography during evaporation are demonstrated directly, and correlated with compositional errors in the reconstructed data. Finite element simulations of the field evaporation process confirm that protruding Au nanoparticles will evolve on the tip surface, and that evaporation field variations lead to an inaccurate assessment of the local composition, effectively lowering the spatial resolution of the final reconstructed dataset. Cross-correlating the experimental data with simulations results in a more detailed understanding of local evaporation aberrations during APT analysis of metal-oxide composites, paving the way towards a more accurate three-dimensional characterization of this technologically important class of materials.

Devaraj, Arun; Colby, Robert J.; Vurpillot, F.; Thevuthasan, Suntharampillai

2014-03-26T23:59:59.000Z

120

Scanning tunneling microscopy studies of the surfaces of a-Si:H and a-SiGe:H films  

SciTech Connect

The report contains a detailed description of the experimental complexities encountered in developing scanning tunneling microscope (STM) probing of atomic structure on the surface of freshly-grown hydrogenated-amorphous semiconductors. It also contains a speculative microscopic film-growth model that explains differences between the disorder in CVD grown a-Ge:H versus a-Si:H films. This model is derived from prior results obtained in the chemical analysis of GeH{sub 4} plasmas, combined with surface reaction and thermodynamic considerations. The neutral radical fragments of silane, disilane and germane dissociation in discharges, which dominate the vapor and film-growth reactions, have been deduced from detailed analysis of prior data and are reported. 4 refs., 7 figs.

Gallagher, A.; Ostrom, R.; Tannenbaum, D. (National Inst. of Standards and Technology, Boulder, CO (USA))

1991-06-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


121

Cryogenic scanning force microscopy of quantum Hall samples: Adiabatic transport originating in anisotropic depletion at contact interfaces  

Science Journals Connector (OSTI)

Anisotropic magnetoresistances and intrinsic adiabatic transport features are generated on quantum Hall samples based on an (Al,Ga)As/GaAs heterostructure with alloyed Au/Ge/Ni contacts. We succeed to probe the microscopic origin of these transport features with a cryogenic scanning force microscope by measuring the local potential distribution within the two-dimensional electron system (2DES). These local measurements reveal the presence of an incompressible strip in front of contacts with insulating properties depending on the orientation of the contact/2DES interface line relatively to the crystal axes of the heterostructure. Such an observation gives another microscopic meaning to the term nonideal contact used in context with the Landauer-Bttiker formalism applied to the quantum Hall effect.

F. Dahlem; E. Ahlswede; J. Weis; K. v. Klitzing

2010-09-10T23:59:59.000Z

122

Mechanically Adjustable Single-Molecule Transistors and Stencil Mask Nanofabrication of High-Resolution Scanning Probes .  

E-Print Network (OSTI)

??This dissertation presents the development of two original experimental techniques to probe nanoscale objects. The first one studies electronic transport in single organic molecule transistors (more)

Champagne, Alexandre

2005-01-01T23:59:59.000Z

123

An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy  

SciTech Connect

In order to achieve elemental and chemical sensitivity in scanning tunneling microscopy (STM), synchrotron x-rays have been applied to excite core-level electrons during tunneling. The x-ray photo-excitations result in tip currents that are superimposed onto conventional tunneling currents. While carrying important physical information, the varying x-ray induced currents can destabilize the feedback loop causing it to be unable to maintain a constant tunneling current, sometimes even causing the tip to retract fully or crash. In this paper, we report on an easy-to-implement filter circuit that can separate the x-ray induced currents from conventional tunneling currents, thereby allowing simultaneous measurements of topography and chemical contrasts. The filter and the schematic presented here can also be applied to other variants of light-assisted STM such as laser STM.

Wang Kangkang; Rosenmann, Daniel; Holt, Martin; Winarski, Robert; Hla, Saw-Wai [Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States); Rose, Volker [Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States); Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States)

2013-06-15T23:59:59.000Z

124

Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ion Beam - Scanning Electron Microscopy  

SciTech Connect

X-ray nanotomography and focused ion beam scanning electron microscopy (FIB?SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIBSEM enable elemental mapping within the microstructure. Using these methods, non?destructive 3D x-ray imaging and FIBSEM serial sectioning have been applied to compare three?dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

Nelson, George J.; Harris, William H.; Lombardo, Jeffrey J.; Izzo, Jr., John R.; Chiu, W. K. S.; Tanasini, Pietro; cantoni, Marco; Van herle, Jan; Comninellis, Christos; Andrews, Joy C.; Liu, Yijin; Pianetta, Piero; Chu, Yong

2011-01-01T23:59:59.000Z

125

Scanning tunneling microscopy on unpinned GaN(1100) surfaces: Invisibility of valence-band states  

Science Journals Connector (OSTI)

We investigated the origins of the tunnel current in scanning tunneling microscopy (STM) and spectroscopy experiments on GaN(1100) surfaces. By calculating the tunnel currents in the presence of a tip-induced band bending for unpinned n-type GaN(1100) surfaces, we demonstrate that only conduction-band states are observed at positive and negative voltage polarities independent of the doping concentration. Valence-band states remain undetectable because tunneling out of the electron-accumulation zone in conduction-band states dominates by four orders of magnitude. As a result band-gap sizes cannot be determined by STM on unpinned GaN(1100) surfaces. Appropriate band-edge positions and gap sizes can be determined on pinned surfaces.

Ph. Ebert, L. Ivanova, and H. Eisele

2009-08-24T23:59:59.000Z

126

Argonne CNM: Proximal Probes Capabilities  

NLE Websites -- All DOE Office Websites (Extended Search)

Proximal Probes Proximal Probes Capabilities Omicron VT-AFM XA microscope scanning tunneling microscope VIew high-resolution image. Variable-temperature, ultra-high-vacuum, atomic force microscope/scanning tunneling microscope: Omicron VT-AFM XA (N. Guisinger, Electronic & Magnetic Materials & Devices Group) Measurement modes include: Contact and non-contact AFM Magnetic force microscopy (MFM) Scanning tunneling spectroscopy Preparation tools include: Resistive sample heating Direct current heating E-beam heating Sputter ion etching Gas dosing E-beam evaporation An analysis chamber contains combined four-grid LEED/Auger optics Omicron nanoprobe View high-resolution image Scanning probe/scanning electron microscopy: Omicron UHV Nanoprobe (N. Guisinger, Electronic & Magnetic Materials & Devices Group)

127

High speed optical coherence microscopy with autofocus adjustment and a miniaturized endoscopic imaging probe  

E-Print Network (OSTI)

Optical coherence microscopy (OCM) is a promising technique for high resolution cellular imaging in human tissues. An OCM system for high-speed en face cellular resolution imaging was developed at 1060 nm wavelength at ...

Aguirre, Aaron Dominic

128

A 4 K cryogenic probe for use in magnetic resonance force microscopy experiments  

SciTech Connect

The detailed design of a mechanically detected nuclear magnetic resonance probe using the SPAM (Springiness Preservation by Aligning Magnetization) geometry, operating at 4 K, in vacuum, and a several-Tesla magnetic field is described. The probe head is vibration-isolated well enough from the environment by a three-spring suspension system that the cantilever achieves thermal equilibrium with the environment without the aid of eddy current damping. The probe uses an ultra-soft Si cantilever with a Ni sphere attached to its tip, and magnetic resonance is registered as a change in the resonant frequency of the driven cantilever. The RF system uses frequency sweeps for adiabatic rapid passage using a 500 ?m diameter RF coil wound around a sapphire rod. The RF coil and optical fiber of the interferometer used to sense the cantilever's position are both located with respect to the cantilever using a Garbini micropositioner, and the sample stage is mounted on an Attocube nanopositioner.

Smith, Doran D.; Alexson, Dimitri A. [U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, Maryland 20783 (United States)] [U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, Maryland 20783 (United States); Garbini, Joseph L. [Mechanical Engineering, University of Washington, Seattle, Washington 98195 (United States)] [Mechanical Engineering, University of Washington, Seattle, Washington 98195 (United States)

2013-09-15T23:59:59.000Z

129

3D Imaging of Porous Media Using Laser Scanning Confocal Microscopy with Application to Microscale Transport Processes  

SciTech Connect

We present advances in the application of laser scanning confocal microscopy (LSCM) to image, reconstruct, and characterize statistically the microgeometry of porous geologic and engineering materials. We discuss technical and practical aspects of this imaging technique, including both its advantages and limitations. Confocal imaging can be used to optically section a material, with sub-micron resolution possible in the lateral and axial planes. The resultant volumetric image data, consisting of fluorescence intensities for typically {approximately}50 million voxels in XYZ space, can be used to reconstruct the three-dimensional structure of the two-phase medium. We present several examples of this application, including studying pore geometry in sandstone, characterizing brittle failure processes in low-porosity rock deformed under triaxial loading conditions in the laboratory, and analyzing the microstructure of porous ceramic insulations. We then describe approaches to extract statistical microgeometric descriptions from volumetric image data, and present results derived from confocal volumetric data sets. Finally, we develop the use of confocal image data to automatically generate a three-dimensional mesh for numerical pore-scale flow simulations.

Fredrich, J.T.

1999-02-10T23:59:59.000Z

130

Atomic-resolution study of polarity reversal in GaSb grown on Si by scanning transmission electron microscopy  

SciTech Connect

The atomic-resolved reversal of the polarity across an antiphase boundary (APB) was observed in GaSb films grown on Si by high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The investigation of the interface structure at the origin of the APB reveals that coalescence of two domains with Ga-prelayer and Sb-prelayer causes the sublattice reversal. The local strain and lattice rotation distributions of the APB, attributed to the discordant bonding length at the APB with the surrounding GaSb lattice, were further studied using the geometric phase analysis technique. The crystallographic characteristics of the APBs and their interaction with other planar defects were observed with HAADF-STEM. The quantitative agreement between experimental and simulated images confirms the observed polarities in the acquired HAADF-STEM data. The self-annihilation mechanism of the APBs is addressed based on the rotation induced by anti-site bonds and APBs' faceting.

Hosseini Vajargah, S.; Woo, S. Y.; Botton, G. A. [Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Ghanad-Tavakoli, S. [Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Kleiman, R. N.; Preston, J. S. [Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Department of Engineering Physics, McMaster University, Hamilton, Ontario L8S 4L7 (Canada)

2012-11-01T23:59:59.000Z

131

Scanning tunneling microscopy study of the Eu-induced Ge(111)-(32)?(34) reconstruction  

Science Journals Connector (OSTI)

Eu-induced (32) reconstruction of the Ge(111) surface has been investigated by scanning tunneling microscopy (STM). The empty-state STM images show the chainlike atomic structure that is similar to those of the metal-induced Si(111)-(32) surfaces with an adsorbate coverage of 1?6 monolayer (ML). The filled-state STM images combined with the empty-state images at the low bias voltage reveal that the Ge arrangement of Eu?Ge(111)-(32) can be well interpreted in terms of the honeycomb chain-channel (HCC) model with the characteristic Ge?Ge double bond and slightly modified Ge honeycomb chains which are similar to those of the 1?6-ML HCC structure of Si(111)-(32). In addition, the Eu?Ge(111)-(32) surface is found to have a local 4 periodicity along Eu chains, which can be explained, based on the analysis of STM line profiles, with two nonequivalent adsorption sites occupied by the Eu atoms in the empty channels of the HCC structure. The structural modifications of the Ge honeycomb chains as well as the origin of the 2 and 4 chains of Eu atoms in the HCC structure on the Eu?Ge(111) surface are discussed.

M. Kuzmin; P. Laukkanen; R. E. Perl; I. J. Vyrynen

2006-03-23T23:59:59.000Z

132

scanning tunneling microscopy | EMSL  

NLE Websites -- All DOE Office Websites (Extended Search)

(3-dimercapto-1-propanol, BAL)significantly reduced extracellular polymeric substances (EPS) expression by Brevundimonas diminuta in suspended cultures at levels just below the...

133

Strain relief and AlSb buffer layer morphology in GaSb heteroepitaxial films grown on Si as revealed by high-angle annular dark-field scanning transmission electron microscopy  

SciTech Connect

The interfacial misfit (IMF) dislocation array of an epitaxial GaSb film on a Si substrate has been imaged with high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The mismatch strain accommodation through dislocation formation has been investigated using geometric phase analysis (GPA) on HAADF-STEM images with atomic resolution to probe the defects' local strain distribution. These measurements indicate that the lattice parameter of the epitaxial film recovers its bulk value within three unit cells from the interface due to the relaxation through IMF dislocations. The atomic number contrast of the HAADF-STEM images and energy dispersive x-ray spectrometry illustrate the formation of islands of AlSb buffer layer along the interface. The role of the AlSb buffer layer in facilitating the GaSb film growth on Si is further elucidated by investigating the strain field of the islands with the GPA.

Vajargah, S. Hosseini; Couillard, M.; Cui, K. [Department of Material Science and Engineering, McMaster University, 1280 Main St. W., Hamilton, Ontario L8S 4M1 (Canada); Tavakoli, S. Ghanad; Robinson, B.; Kleiman, R. N.; Preston, J. S. [Department of Engineering Physics, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Botton, G. A. [Department of Material Science and Engineering, McMaster University, 1280 Main St. W., Hamilton, Ontario L8S 4M1 (Canada); Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario L8S 4M1 (Canada)

2011-02-21T23:59:59.000Z

134

Combining In-Situ Buffer-Layer-Assisted-Growth with Scanning...  

NLE Websites -- All DOE Office Websites (Extended Search)

growth (BLAG) technique by combining EMSL's ultra-high vacuum scanning probe microscopy (UHV SPM) and applying the resulting novel tool for formation and structural study of BaO...

135

Atom probe field-ion microscopy investigation of nickel base superalloy welds  

SciTech Connect

Microstructure development and elemental partitioning between {gamma} and {gamma}{prime} were measured in PWA-1480 electron beam welds and CMSX-4 pulsed-laser welds. In PWA-1480 EB welds, eutectic {gamma}{prime} phases were observed along the dendritic boundaries. The elemental partitioning between {gamma} and {gamma}{prime} was found to be similar to that in PWA-1480 base metal. In CMSX-4 pulsed laser welds, negligible eutectic {gamma}{prime} was observed. In addition, fine and irregularly shaped {gamma}{prime} precipitates were observed. The elemental partitioning between {gamma} and {gamma}{prime} was found to be different from that measured in the base metal. Large concentration gradients were observed in the {gamma} phase. The {gamma}{prime} precipitation kinetics in CM247DS alloy was measured using dilatometry and showed differences with different cooling rates. The microstructural investigations showed that at large undercoolings the number density of {gamma}{prime} precipitates increased and led to a finer size. This supports the microstructure development observations in PWA-1480 and CMSX-4 welds. Thermodynamic and kinetic calculations for the Ni-Al-Cr alloy system showed that as the cooling rate increases, the {gamma}{prime} growth leads to large concentration gradients in the {gamma} phase. The calculations agree with the atom probe results from PWA-1480 and CMSX-4 welds.

Babu, S.S.; David, S.A.; Vitek, J.M.; Miller, M.K.

1998-11-01T23:59:59.000Z

136

Sample mounting and transfer for coupling an ultrahigh vacuum variable temperature beetle scanning tunneling microscope with conventional surface probes  

SciTech Connect

We present a new ultrahigh vacuum (UHV) chamber for surface analysis and microscopy at controlled, variable temperatures. The new instrument allows surface analysis with Auger electron spectroscopy, low energy electron diffraction, quadrupole mass spectrometer, argon ion sputtering gun, and a variable temperature scanning tunneling microscope (VT-STM). In this system, we introduce a novel procedure for transferring a sample off a conventional UHV manipulator and onto a scanning tunneling microscope in the conventional ''beetle'' geometry, without disconnecting the heating or thermocouple wires. The microscope, a modified version of the Besocke beetle microscope, is mounted on a 2.75 in. outer diameter UHV flange and is directly attached to the base of the chamber. The sample is attached to a tripod sample holder that is held by the main manipulator. Under UHV conditions the tripod sample holder can be removed from the main manipulator and placed onto the STM. The VT-STM has the capability of acquiring images between the temperature range of 180--500 K. The performance of the chamber is demonstrated here by producing an ordered array of island vacancy defects on a Pt(111) surface and obtaining STM images of these defects.

Nafisi, Kourosh; Ranau, Werner; Hemminger, John C.

2001-01-01T23:59:59.000Z

137

Real-time monitoring of quorum sensing in 3D-printed bacterial aggregates using scanning electrochemical microscopy  

Science Journals Connector (OSTI)

...manipulating small populations. Micro-3D printing is a lithographic technique capable...cells or small populations. This 3D-printing strategy can organize bacteria...behaviors. Here, we combined micro-3D printing and scanning electrochemical...

Jodi L. Connell; Jiyeon Kim; Jason B. Shear; Allen J. Bard; Marvin Whiteley

2014-01-01T23:59:59.000Z

138

Probing the Degradation Mechanisms in Electrolyte Solutions for Li-ion Batteries by In-Situ Transmission Electron Microscopy  

SciTech Connect

One of the goals in the development of new battery technologies is to find new electrolytes with increased electrochemical stability. In-situ (scanning) transmission electron microscopy ((S)TEM) using an electrochemical fluid cell provides the ability to rapidly and directly characterize electrode/electrolyte interfacial reactions under battery relevant electrochemical conditions. Furthermore, as the electron beam itself causes a localized electrochemical reaction when it interacts with the electrolyte, the breakdown products that occur during the first stages of battery operation can potentially be simulated and characterized using a straightforward in-situ liquid stage (without electrochemical biasing capabilities). In this paper, we have studied the breakdown of a range of inorganic/salt complexes that are used in state-of-the-art Li-ion battery systems. The results of the in-situ (S)TEM experiments matches with previous stability tests performed during battery operation and the breakdown products and mechanisms are also consistent with known mechanisms. This analysis indicates that in-situ liquid stage (S)TEM observations can be used to directly test new electrolyte designs and provide structural insights into the origin of the solid electrolyte interphase (SEI) formation mechanism.

Abellan Baeza, Patricia; Mehdi, Beata L.; Parent, Lucas R.; Gu, Meng; Park, Chiwoo; Xu, Wu; Zhang, Yaohui; Arslan, Ilke; Zhang, Jiguang; Wang, Chong M.; Evans, James E.; Browning, Nigel D.

2014-02-21T23:59:59.000Z

139

Frustration in the Si(111) pseudo 55 Cu structure directly observed by scanning tunneling microscopy  

Science Journals Connector (OSTI)

Frustration in a surface structure has been observed in real space and time using the scanning tunneling microscope. The frustration is revealed as an instability of an inherent feature in the Si(111) pseudo 55 Cu structure. A possible origin of the frustration is proposed.

K. Mortensen

1991-01-28T23:59:59.000Z

140

Scanning ultrasonic probe  

DOE Patents (OSTI)

The invention is an ultrasonic testing device for rapid and complete examination of the test specimen, and is particularly well suited for evaluation of tubular test geometries. A variety of defect categories may be detected and anlayzed at one time and their positions accurately located in a single pass down the test specimen.

Kupperman, D.S.; Reimann, K.J.

1980-12-09T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


141

Formation of the 55 reconstruction on cleaved Si(111) surfaces studied by scanning tunneling microscopy  

Science Journals Connector (OSTI)

The transformation of cleaved Si(111)21 surfaces into apparent 11, 55, and 77 structures has been studied with the scanning tunneling microscope. Two reaction paths are identified, one proceeding through a disordered adatom arrangement into the 77 structure, and the other proceeding directly from 21 into the 55 structure. Near a nucleation site (step or domain boundary), the first path is favored due to the abundance of adatoms on the surface, and far from a nucleation site the second path dominates.

R. M. Feenstra and M. A. Lutz

1990-09-15T23:59:59.000Z

142

Surface species formed by the adsorption and dissociation of water molecules on Ru(0001) surface containing a small coverage of carbon atoms studied by scanning tunneling microscopy  

SciTech Connect

The adsorption and dissociation of water on a Ru(0001) surface containing a small amount ({le} 3 %) of carbon impurities was studied by scanning tunneling microscopy (STM). Various surface species are formed depending on the temperature. These include molecular H{sub 2}O, H{sub 2}O-C complexes, H, O, OH and CH. Clusters of either pure H{sub 2}O or mixed H{sub 2}O-OH species are also formed. Each of these species produces a characteristic contrast in the STM images and can be identified by experiment and by ab initio total energy calculations coupled with STM image simulations. Manipulation of individual species via excitation of vibrational modes with the tunneling electrons has been used as supporting evidence.

Dept of Materials Science and Engineering UCB; Dept of Applied Science and Technology, UCB; Institut de Ciencia de Materials de Barcelona, Barcelona, Spain; Instituto de Ciencia de Materiales de Madrid, Madrid, Spain; Department of Mechanical Engineering, Yale University; Salmeron, Miquel; Shimizu, Tomoko K.; Mugarza, Aitor; Cerda, Jorge I.; Heyde, Markus; Qi, Yabing; Schwarz, Udo D.; Ogletree, D. Frank; Salmeron, Miquel

2008-04-26T23:59:59.000Z

143

Electronic structures and bonding properties of chlorine-treated nitrogenated carbon nanotubes: X-ray absorption and scanning photoelectron microscopy studies  

SciTech Connect

The electronic and bonding properties of nitrogenated carbon nanotubes (N-CNTs) exposed to chlorine plasma were investigated using C and N K-edge x-ray absorption near-edge structure (XANES) and scanning photoelectron microscopy (SPEM). The C and N K-edge XANES spectra of chlorine-treated N-CNTs consistently reveal the formation of pyridinelike N-CNTs by the observation of 1s{yields}{pi}*(e{sub 2u}) antibonding and 1s{yields}{pi}*(b{sub 2g}) bonding states. The valence-band photoemission spectra obtained from SPEM images indicate that chlorination of the nanotubes enhances the C-N bonding. First-principles calculations of the partial densities of states in conjunction with C K-edge XANES data identify the presence of C-Cl bonding in chlorine treated N-CNTs.

Ray, S. C.; Pao, C. W.; Tsai, H. M.; Chiou, J. W.; Pong, W. F.; Chen, C. W.; Tsai, M.-H.; Papakonstantinou, P.; Chen, L. C.; Chen, K. H.; Graham, W. G. [Department of Physics, Tamkang University, Tamsui 251, Taiwan (China); Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Department of Physics, National Sun Yat-Sen University, Kaohsiung 804, Taiwan (China); NRI, School of Electrical and Mechanical Engineering, University of Ulster at Jordanstown, Newtownabbey, County Antrim BT37OQB, Northern Ireland (United Kingdom); Center for Condensed Matter Sciences, National Taiwan University, Taipei 106, Taiwan (China); Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan (China); Department of Physics and Astronomy, Queens University of Belfast, Belfast, Antrim BT71NN, Northern Ireland (United Kingdom)

2007-05-07T23:59:59.000Z

144

Contrast stability and "stripe" formation in Scanning Tunnelling Microscopy imaging of highly oriented pyrolytic graphite: The role of STM-tip orientations  

E-Print Network (OSTI)

Highly oriented pyrolytic graphite (HOPG) is an important substrate in many technological applications and is routinely used as a standard in Scanning Tunnelling Microscopy (STM) calibration, which makes the accurate interpretation of the HOPG STM contrast of great fundamental and applicative importance. We demonstrate by STM simulations based on electronic structure obtained from first principles that the relative local orientation of the STM-tip apex with respect to the HOPG substrate has a considerable effect on the HOPG STM contrast. Importantly for experimental STM analysis of HOPG, the simulations indicate that local tip-rotations maintaining a major contribution of the $d_{3z^2-r^2}$ tip-apex state to the STM current affect only the secondary features of the HOPG STM contrast resulting in "stripe" formation and leaving the primary contrast unaltered. Conversely, tip-rotations leading to enhanced contributions from $m\

Mndi, Gbor; Palots, Krisztin

2014-01-01T23:59:59.000Z

145

Infrared Scattering Scanning Near-Field Optical Microscopy Using An External Cavity Quantum Cascade Laser For Nanoscale Chemical Imaging And Spectroscopy of Explosive Residues  

SciTech Connect

Infrared scattering scanning near-field optical microscopy (s-SNOM) is an apertureless superfocusing technique that uses the antenna properties of a conducting atomic force microscope (AFM) tip to achieve infrared spatial resolution below the diffraction limit. The instrument can be used either in imaging mode, where a fixed wavelength light source is tuned to a molecular resonance and the AFM raster scans an image, or in spectroscopy mode where the AFM is held stationary over a feature of interest and the light frequency is varied to obtain a spectrum. In either case, a strong, stable, coherent infrared source is required. Here we demonstrate the integration of a broadly tunable external cavity quantum cascade laser (ECQCL) into an s-SNOM and use it to obtain infrared spectra of microcrystals of chemicals adsorbed onto gold substrates. Residues of the explosive compound tetryl was deposited onto gold substrates. s-SNOM experiments were performed in the 1260-1400 cm?1 tuning range of the ECQCL, corresponding to the NO2 symmetric stretch vibrational fingerprint region. Vibrational infrared spectra were collected on individual chemical domains with a collection area of *500nm2 and compared to ensemble averaged far-field reflection-absorption infrared spectroscopy (RAIRS) results.

Craig, Ian M.; Phillips, Mark C.; Taubman, Matthew S.; Josberger, Erik E.; Raschke, Markus Bernd

2013-02-04T23:59:59.000Z

146

Correlation between Charge State of Insulating NaCl Surfaces and Ionic Mobility Induced by Water Adsorption: A Combined Ambient Pressure X-ray Photoelectron Spectroscopy and Scanning Force Microscopy Study  

SciTech Connect

In situ ambient pressure X-ray photoelectron spectroscopy (APPES) and scanning force microscopy were used to characterize the surface discharge induced by water layers grown on (001) surfaces of sodium chloride single crystals. The APPES studies show that both kinetic energy (KE) and full width at half-maximum (FWHM) of the Na 2s and Cl 2p core level peaks, monitored as a function of relative humidity (RH), mimic surface conductivity curves measured using scanning force microscopy. The KE position and FWHM of the core level peaks therefore are directly related to the solvation and diffusion of ions at the NaCl(100) surface upon adsorption of water.

Verdaguer, Albert; Jose Segura, Juan; Fraxedas, Jordi; Bluhm, Hendrik; Salmeron, Miquel

2008-09-03T23:59:59.000Z

147

Spin torque and heating effects in current-induced domain wall motion probed by transmission electron microscopy  

E-Print Network (OSTI)

Spin torque and heating effects in current-induced domain wall motion probed by transmission- ternative to the use of conventional external magnetic fields, therefore opening up a route for simple device fabrication, where no field-generating strip lines are necessary. While current-induced domain

Dunin-Borkowski, Rafal E.

148

Scanning tunneling microscopy and spectroscopy of Bi-Sr-Ca-Cu-O 2:2:1:2 high-temperature superconductors  

Science Journals Connector (OSTI)

We have used scanning tunneling microscopy and spectroscopy to investigate the surface-topographic and electronic properties of Bi-Sr-Ca-Cu-O 2:2:1:2 compounds. Even though there are two atoms (Bi and O) per lattice point, only one corrugation maximum per lattice point is observed. Polarity-dependent images show that the corrugations of the images taken at opposite polarities are in phase. We discuss possible explanations for this observation of in-phase corrugations at opposite polarities. Spectroscopic data were obtained at both high and low sample biases. Our data show that the density of surface electronic states near the Fermi level is about 34 orders of magnitude smaller than that of a typical metal. These states are only detectable when the stabilization voltage of the tunnel junction is low (<1.5 V). The conductivity near zero bias is extremely nonlinear, consistent with a nonmetallic surface layer. Vacuum resonant tunneling studies show that at these low-bias voltages the tip-to-sample distance is very small (?36 ). This small tip-to-sample distance implies that the conductivity we detect near zero bias might result from the underlying CuO layer. We find evidence of bias-field penetration into the sample, implying that the surface density of states near the Fermi level is too small to screen out the electric field.

C. K. Shih; R. M. Feenstra; G. V. Chandrashekhar

1991-04-01T23:59:59.000Z

149

Absence of spin-flip transition at the Cr(001) surface: A combined spin-polarized scanning tunneling microscopy and neutron scattering study  

SciTech Connect

The spin-density wave (SDW) on Cr(001) has been investigated at temperatures between 20-300 K by means of spin-polarized scanning tunneling microscopy (SP-STM). Although neutron-scattering data measured on the same crystal clearly show a spin-flip transition from a transversal (T)-SDW to a longitudinal (L)-SDW at the expected spin-flip (SF) temperature T{sub SF}=123 K, no change was found on the Cr(001) surface with SP-STM. Throughout the entire temperature range the Cr(001) surface maintains a topological antiferromagnetic order with an in-plane magnetization that inverts between adjacent atomically flat terraces separated by monatomic step edges. The experimental results are interpreted by an absence of a spin-flip transition in the near-surface region probably driven by the surface anisotropy. The continuous connection of the surface T-SDW to the bulk L-SDW is accomplished by the formation of a 90 deg. domain wall just below the surface.

Haenke, T.; Krause, S.; Berbil-Bautista, L.; Bode, M.; Wiesendanger, R.; Wagner, V.; Lott, D.; Schreyer, A. [Institute of Applied Physics and Microstructure Research Center, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg (Germany); Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig (Germany); Institut fuer Werkstoffforschung, GKSS Forschungszentrum, Max-Planck-Strasse 1, D-21502 Geesthacht (Germany)

2005-05-01T23:59:59.000Z

150

Direct comparison between X-ray nanotomography and scanning electron microscopy for the microstructure characterization of a solid oxide fuel cell anode  

SciTech Connect

X-ray computed nanotomography (nano-CT) and scanning electron microscopy (SEM) have been applied to characterize the microstructure of a Solid Oxide Fuel Cell (SOFC) anode. A direct comparison between the results of both methods is conducted on the same region of the microstructure to assess the spatial resolution of the nano-CT microstructure, SEM being taken as a reference. A registration procedure is proposed to find out the position of the SEM image within the nano-CT volume. It involves a second SEM observation, which is taken along an orthogonal direction and gives an estimate reference SEM image position, which is then refined by an automated optimization procedure. This enables an unbiased comparison between the cell porosity morphologies provided by both methods. In the present experiment, nano-CT is shown to underestimate the number of pores smaller than 1 ?m and overestimate the size of the pores larger than 1.5 ?m. - Highlights: ? X-ray computed nanotomography (nano-CT) and SEM are used to characterize an SOFC anode. ? A methodology is proposed to compare the nano-CT and SEM data on the same region. ? The spatial resolution of the nano-CT data is assessed from that comparison.

Quey, R., E-mail: quey@emse.fr [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); cole des Mines de Saint-tienne, CNRS UMR 5307, 158 cours Fauriel, 42023 Saint-tienne, Cedex 2 (France); Suhonen, H., E-mail: heikki.suhonen@esrf.fr [European Synchrotron Radiation Facility (ESRF), 6 Rue Jules Horowitz BP 220, 38043 Grenoble (France); Laurencin, J., E-mail: jerome.laurencin@cea.fr [CEA-Liten, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Cloetens, P., E-mail: peter.cloetens@esrf.fr [European Synchrotron Radiation Facility (ESRF), 6 Rue Jules Horowitz BP 220, 38043 Grenoble (France); Bleuet, P., E-mail: pierre.bleuet@cea.fr [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France)

2013-04-15T23:59:59.000Z

151

Elemental relationships in rock varnish as seen with SEM/EDX (scanning electron microscopy/energy dispersive x-ray) elemental line profiling  

SciTech Connect

The heterogeneous nature of rock varnish requires a thorough survey of elemental and mineralogic compositions before relating chemical variability of rock varnish to past geochemical environments. Elemental relationships in rock varnish can be examined using scanning electron microscopy (SEM) in conjunction with an elemental line profiling routine using semi-quantitative, energy dispersive x-ray (EDX) analysis. Results of SEM/EDX analysis suggest: variations in cation concentrations used in varnish cation ratio dating relate more specifically to variations in detritus within the varnish than to element mobility as defined by weathering indices; Mn concentration rather than Mn:Fe ratios may be a more appropriate indicator of paleoclimatic fluctuations; and the Mn-oxide phase existing in varnish is most likely a Ba-enriched phase rather than birnessite. Element line profiling offers great potential for gaining insights into geochemical processes affecting the deposition and diagenesis of rock varnish and for testing hypotheses relating to its chemical variability. 27 refs., 9 figs.

Raymond, R. Jr.; Reneau, S.L.; Harrington, C.D.

1990-01-01T23:59:59.000Z

152

Quantification of Artifacts in Scanning Electron Microscopy Tomography: Improving the Reliability of Calculated Transport Parameters in Energy Applications such as Fuel Cell and Battery Electrodes  

Science Journals Connector (OSTI)

Abstract Focused ion beam and scanning electron microscopy tomography (FIB-SEMt) is commonly used to extract reactant transport relevant parameters from nano-porous materials in energy applications, such as fuel cells or batteries. Here we present an approach to virtually model the errors in FIB-SEMt which are caused by the FIB cutting distance. The errors are evaluated in terms of connectivity, solid volume fraction (SVF), conductivity, diffusivity, as well as mean grain and pore sizes. For state-of-the-art FIB-SEMt experiments, where a hydrogen fuel cell catalyst layer with 60 nm mean grain size and 40 % SVF is sectioned with a cutting distance of 15 nm, the error in our simulation ranges up to 51 % (conductivity), whereas other parameters remain largely unaffected (Laplace diffusivity, 4 %). We further present a method, employing virtual coarsening and back interpolation, to reduce FIB cutting distance errors in all investigated parameters. Both error evaluation and correction are applicable to sphere based porous materials with relevance for the energy conversion and storage sector such as polymer electrolyte membrane fuel cell catalyst layer (PEMFC CL), battery carbon binder domain (CBD) or supercapacitor electrodes.

Matthias Klingele; Roland Zengerle; Simon Thiele

2014-01-01T23:59:59.000Z

153

Electronic and structural properties of the InP(100)(2נ4) surface studied by core-level photoemission and scanning tunneling microscopy  

Science Journals Connector (OSTI)

The (2נ4)-reconstructed InP(100) surfaces have been investigated by scanning tunneling microscopy (STM) and synchrotron-radiation core-level photoelectron spectroscopy. STM observations show that the ?2 model describes the atomic structure of the InP(100)(2נ4) surface in a limited range of the surface-preparation conditions, as predicted theoretically but not previously observed. STM results also support the accuracy of the previously found mixed-dimer structure for the InP(100)(2נ4) surface under less P-rich conditions. A study of P 2p core-level photoelectron spectra, measured with different surface-sensitivity conditions, demonstrates that P 2p photoemission from the mixed-dimer InP(100)(2נ4) surface consists of at least two surface-core-level-shift (SCLS) components which have kinetic energies approximately 0.4eV higher and 0.3eV lower than the bulk emission. On the basis of the surface-sensitivity difference between these SCLSs, they are related to the third-layer and top-layer P sites in the mixed-dimer structure, respectively.

P. Laukkanen; J. Pakarinen; M. Ahola-Tuomi; M. Kuzmin; R.E. Perl; I.J. Vyrynen; A. Tukiainen; V. Rimpilinen; M. Pessa; M. Adell; J. Sadowski

2006-01-01T23:59:59.000Z

154

The structures and dynamics of atomic and molecular adsorbates on metal surfaces by scanning tunneling microscopy and low energy electron diffraction  

SciTech Connect

Studies of surface structure and dynamics of atoms and molecules on metal surfaces are presented. My research has focused on understanding the nature of adsorbate-adsorbate and adsorbate-substrate interactions through surface studies of coverage dependency and coadsorption using both scanning tunneling microscopy (STM) and low energy electron diffraction (LEED). The effect of adsorbate coverage on the surface structures of sulfur on Pt(111) and Rh(111) was examined. On Pt(111), sulfur forms p(2x2) at 0.25 ML of sulfur, which transforms into a more compressed ({radical}3x{radical}3)R30{degrees} at 0.33 ML. On both structures, it was found that sulfur adsorbs only in fcc sites. When the coverage of sulfur exceeds 0.33 ML, it formed more complex c({radical}3x7)rect structure with 3 sulfur atoms per unit cell. In this structure, two different adsorption sites for sulfur atoms were observed - two on fcc sites and one on hcp site within the unit cell.

Yoon, Hyungsuk Alexander

1996-12-01T23:59:59.000Z

155

Spectroscopic ellipsometric modeling of a BiTeSe write layer of an optical data storage device as guided by atomic force microscopy, scanning electron microscopy, and X-ray diffraction  

Science Journals Connector (OSTI)

Abstract Conventional magnetic tape is the most widely used medium for archival data storage. However, data stored on it need to be migrated every ca. 5years. Recently, optical discs that store information for hundreds, or even more than 1000years, have been introduced to the market. We recently proposed that technology in these optical discs be used to make an optical tape that would show greater permanence than its magnetic counterpart. Here we provide a detailed optical characterization of a sputtered thin film of bismuth, tellurium, and selenium (BTS) that is a proposed data storage layer for these devices. The methodology described herein should be useful in the future development of related materials. Spectroscopic ellipsometry (SE) data are obtained using interference enhancement, and the modeling of this data is guided by results from atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), and X-ray reflectivity (XRR). By AFM, ca. 40nm BTS films show ca. 10nm roughness. SEM images also suggest considerable roughness in the films and indicate that they are composed of 13.15.9nm grains. XRD confirms that the films are crystalline and predicts a grain size of 172nm. XRD results are consistent with the composition of the films a mildly oxidized BTS material. Three models of increasing complexity are investigated to explain the SE data. The first model consists of a smooth, homogeneous BTS film. The second model adds a roughness layer to the previous model. The third model also has two layers. The bottom layer is modeled as a mixture of BTS and void using a Bruggeman effective medium approximation. The upper layer is similarly modeled, but with a gradient. The first model was unable to adequately model the SE data. The second model was an improvement lower MSE (4.4) and good agreement with step height measurements. The third model was even better very low MSE (2.6) and good agreement with AFM results. The third SE model predicted ca. 90% void at the film surface. XRR modeling of the film agreed well with the predictions from SE. The uniquenesses of the SE models were confirmed.

Hao Wang; Nitesh Madaan; Jacob Bagley; Anubhav Diwan; Yiqun Liu; Robert C. Davis; Barry M. Lunt; Stacey J. Smith; Matthew R. Linford

2014-01-01T23:59:59.000Z

156

Spectroscopy and atomic force microscopy of biomass  

NLE Websites -- All DOE Office Websites (Extended Search)

Spectroscopy Spectroscopy and atomic force microscopy of biomass L. Tetard a,b , A. Passian a,b,n , R.H. Farahi a , U.C. Kalluri c , B.H. Davison c , T. Thundat a,b a Biosciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA b Department of Physics, University of Tennessee, Knoxville, TN 37996, USA c Environmental Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA a r t i c l e i n f o Keywords: Atomic force microscopy Spectroscopy Plant cells Biomass Nanomechanics a b s t r a c t Scanning probe microscopy has emerged as a powerful approach to a broader understanding of the molecular architecture of cell walls, which may shed light on the challenge of efficient cellulosic ethanol production. We have obtained preliminary images of both Populus and switchgrass samples using atomic force microscopy (AFM). The results show distinctive features that are shared by switchgrass

157

Directly correlated transmission electron microscopy and atom...  

NLE Websites -- All DOE Office Websites (Extended Search)

Directly correlated transmission electron microscopy and atom probe tomography of grain boundary oxidation in a Ni-Al binary Directly correlated transmission electron microscopy...

158

In-Situ Transmission Electron Microscopy Probing of Native Oxide and Artificial Layers on Silicon Nanoparticles for Lithium Ion Batteries  

SciTech Connect

Surface modification of silicon nanoparticle via molecular layer deposition (MLD) has been recently proved to be an effective way for dramatically enhancing the cyclic performance in lithium ion batteries. However, the fundamental mechanism as how this thin layer of coating function is not known, which is even complicated by the inevitable presence of native oxide of several nanometers on the silicon nanoparticle. Using in-situ TEM, we probed in detail the structural and chemical evolution of both uncoated and coated silicon particles upon cyclic lithiation/delithation. We discovered that upon initial lithiation, the native oxide layer converts to crystalline Li2O islands, which essentially increases the impedance on the particle, resulting in ineffective lithiation/delithiation, and therefore low coulombic efficiency. In contrast, the alucone MLD coated particles show extremely fast, thorough and highly reversible lithiation behaviors, which are clarified to be associated with the mechanical flexibility and fast Li+/e- conductivity of the alucone coating. Surprisingly, the alucone MLD coating process chemically changes the silicon surface, essentially removing the native oxide layer and therefore mitigates side reaction and detrimental effects of the native oxide. This study provides a vivid picture of how the MLD coating works to enhance the coulombic efficiency and preserve capacity and clarifies the role of the native oxide on silicon nanoparticles during cyclic lithiation and delithiation. More broadly, this work also demonstrated that the effect of the subtle chemical modification of the surface during the coating process may be of equal importance as the coating layer itself.

He, Yang; Piper, Daniela M.; Gu, Meng; Travis, Jonathan J.; George, Steven M.; Lee, Se-Hee; Genc, Arda; Pullan, Lee; Liu, Jun; Mao, Scott X.; Zhang, Jiguang; Ban, Chunmei; Wang, Chong M.

2014-10-27T23:59:59.000Z

159

Novel Approaches to Soft X-ray Spectroscopy: Scanning TransmissionX-ray Microscopy and Ambient Pressure X-Ray PhotoelectronSpectroscopy  

SciTech Connect

This workshop focused on novel spectroscopies at Beamlines 11.0.2, 5.3.2 and 9.3.2 at the ALS. The workshop brought together users from a wide range of fields to highlight recent experimental and technical developments both in scanning transmission X-ray spectroscopy (STXM) and ambient pressure photoelectron spectroscopy (APPES). The morning session featured talks on experiments involving new developments at the STXM, while the afternoon session was devoted to those using APXPS. In the morning session, Tolek Tyliszczak discussed the improved detector developments at the STXM, such as an avalanche photodiode detector and fluorescence and electron detection, as well as the continued development of in situ cells for heating, gas flow, and electrochemical cells. Of these, only the avalanche photodiode in combination with a novel multichannel photon-counting system is in routine use in time-resolved studies. Bartel Van Waeyenberge (Ghent University) presented results of magnetic imaging with a time resolution of 70-100 ps combined with a lateral resolution of 20-40 nm performed with the STXM (Beamline 11.0.2). As a complement to the time-domain ''pump-and-probe'' measurements, they developed a frequency-domain ''sine-excitation'' technique in order to study specific eigenmodes of these ferromagnetic patterns with high spatial resolution. This new approach was used to study the gyrotropic vortex motions in micron-sized ferromagnetic patterns. Adam Hitchcock (McMaster University) presented the development, in collaboration with Daniel Guay (INRS, Varennes) and Sherry Zhang, of the apparatus and techniques for applying STXM to in-situ studies of electrochemistry, in particular electrochromism in polyaniline. In addition, substantial progress was reported on a joint project to develop substrates and methods for chemically selective lithography of multilayer polymer systems. Selective patterns, such as that displayed in the figure, can now be written efficiently with the bend magnet STXM on Beamline 5.3.2. Yves Acremann (SSRL) discussed time and spatially resolved X-ray magnetic circular dichroism (XMCD) experiments on spin transfer devices at the STXM (Beamline 11.0.2). These elegant experiments explore time resolved measurements of the magnetization dynamics within a 100 x 150 nm sample influenced by a spin-polarized current. This experiment shows that the magnetization in these magnetic nanostructures are not uniform, as they are influenced by the Oersted field of the charge current needed to generate the spin current. The implementation of a novel multichannel photon counting system in combination with an avalanche photon detector decreased the data-acquisition time by a factor of 10, owing to its ability to resolve the structure of multi bunch mode. Gordon E. Brown, Jr. (Stanford University and SSRL) described ''Applications of STXM to Microbial Bioweathering and Biomineralization''. In the interaction of bacteria with ferrihydrite nanoparticles, microenvironments that were very different than the bulk material were observed, showing that bulk thermodynamics may not be useful for predicting micro phases. Gordon also presented work showing that iron nanoparticles are attracted to the negatively charged bacteria and form a coating that reduces iron oxide minerals. The afternoon session started with presentations by Simon Mun and Hendrik Bluhm, who discussed the current status and the future plans for the two APPES end-stations at the ALS, which are located at Beamlines 9.3.2 and 11.0.2, respectively. In both end-stations, samples can be measured in gaseous environments at pressures of up to several Torr, which makes possible the investigation of numerous phenomena, in particular in the fields of atmospheric and environmental science as well as heterogeneous catalysis. Specific examples of the application of APPES were shown in the following presentations. John Hemminger (University of California, Irvine) reported on APPES investigations at Beamlines 9.3.2 and 11.0.2 of the interaction of alkali halide surfaces with water. The m

Bluhm, Hendrik; Gilles, Mary K.; Mun, Simon B.; Tyliszczak, Tolek

2006-02-01T23:59:59.000Z

160

Electric field and humidity effects on adsorbed water behavior on BaTiO3 ferroelectric domains studied by scanning probe microscopy  

E-Print Network (OSTI)

Electric field and humidity effects on adsorbed water behavior on BaTiO3 ferroelectric domains 2014; published online 28 August 2014) Distribution of the adsorbed water on BaTiO3 ferroelectric, which adsorb on the material surface, cause delayed cracking and fracture of ferroelectric ceramics.15

Volinsky, Alex A.

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to obtain the most current and comprehensive results.


161

Influence of Surface Preparation on Scanning Kelvin Probe Microscopy and Electron Backscatter Diffraction Analysis of Cross Sections of CdTe/CdS Solar Cells: Preprint  

SciTech Connect

In this work we investigated different methods to prepare cross sections of CdTe/CdS solar cells for EBSD and SKPM analyses. We observed that procedures used to prepare surfaces for EBSD are not suitable to prepare cross sections, and we were able to develop a process using polishing and ion-beam milling. This process resulted in very good results and allowed us to reveal important aspects of the cross section of the CdTe film. For SKPM, polishing and a light ion-beam milling resulted in cross sections that provided good data. We were able to observe the depletion region on the CdTe film and the p-n junction as well as the interdiffusion layer between CdTe and CdS. However, preparing good-quality cross sections for SKPM is not a reproducible process, and artifacts are often observed.

Moutinho, H. R.; Dhere, R. G.; Jiang, C. S.; Al-Jassim, M. M.

2011-06-01T23:59:59.000Z

162

Intrinsic current-voltage properties of nanowires with four-probe scanning tunneling microscopy: A conductance transition of ZnO nanowire  

E-Print Network (OSTI)

strain. The ZnO-nanowire samples used in our experiments were synthesized via reduction and oxidation of ZnS powder13 and dispersed on a silicon wafer coated with a 500-nm-thick silicon dioxide layer as insulator. The STM tips were made from a tungsten or gold wire using the stan- dard preparation proce

Liu, Feng

163

Journal of Magnetism and Magnetic Materials 286 (2005) 324328 Light-free magnetic resonance force microscopy for studies of  

E-Print Network (OSTI)

Journal of Magnetism and Magnetic Materials 286 (2005) 324­328 Light-free magnetic resonance force for Physical Sciences, College Park, MD, USA Available online 4 November 2004 Abstract Magnetic resonance force microscopy is a scanned probe technique capable of three-dimensional magnetic resonance imaging. Its

164

Raman Microscopy and Mapping as a Probe for Photodegradation in Surface Relief Gratings Recorded on Layer-by-Layer Films of Congo Red/Polyelectrolyte  

Science Journals Connector (OSTI)

Raman microscopy, mapping, and surface-enhanced Raman scattering techniques have been applied to investigate the degradation of Congo Red (CR) in a surface relief grating (SRG)...

Constantino, C J L; Aroca, R F; He, J -A; Zucolotto, V; Li, L; Oliveira, O N; Kumar, J; Tripathy, S K

2002-01-01T23:59:59.000Z

165

Scanning Josephson Tunneling Microscopy of Single Crystal Bi2Sr2CaCu2O8+delta with a Conventional Superconducting Tip  

SciTech Connect

We have performed both Josephson and quasiparticle tunneling in vacuum tunnel junctions formed between a conventional superconducting scanning tunneling microscope tip and overdoped Bi2Sr2CaCu2O8+ single crystals. A Josephson current is observed with a peak centered at a small finite voltage due to the thermal-fluctuation-dominated superconducting phase dynamics. Josephson measurements at different surface locations yield local values for the Josephson ICRN product. Corresponding energy gap measurements were also performed and a surprising inverse correlation was observed between the local ICRN product and the local energy gap.

Kimura, H.; Barber Jr., R. P.; Ono, S.; Ando, Yoichi; Dynes, Robert C.

2009-10-28T23:59:59.000Z

166

Design and Development of a Nanoscale Multi Probe System Using Open Source SPM Controller and GXSM Software: A Tool of Nanotechnology  

E-Print Network (OSTI)

We report our design, development, installation and troubleshooting of an open source Gnome X Scanning Microscopy (GXSM) software package for controlling and processing of modern Scanning Probe Microscopy (SPM) system as a development tool of Nanotechnology. GXSM is a full featured analysis tool for the characterization of nanomaterials with different controlling tools like Atomic Force Microscopy (AFM), Scanning Tunneling Spectroscopy (STS), scanning tunneling microscopy (STM), Nanoindentation and etc.,. This developed package tool consists of Digital Signal Processing (DSP) and image processing system of SPM. A digital signal processor (DSP) subsystem runs the feedback loop, generates the scanning signals and acquires the data during SPM measurements. With installed SR-Hwl plug-in this developed package was tested in no hardware mode.

Babu, S K Suresh; Moni, D Jackuline; Devaprakasam, D

2014-01-01T23:59:59.000Z

167

End station for nanoscale magnetic materials study: Combination of scanning tunneling microscopy and soft X-ray magnetic circular dichroism spectroscopy  

SciTech Connect

We have constructed an end station for nanoscale magnetic materials study at the soft X-ray beamline HiSOR BL-14 at Hiroshima Synchrotron Radiation Center. An ultrahigh-vacuum scanning tunneling microscope (STM) was installed for an in situ characterization of nanoscale magnetic materials in combination with soft X-ray magnetic circular dichroism (XMCD) spectroscopy experiment. The STM was connected to the XMCD experimental station via damper bellows to isolate it from environmental vibrations, thus achieving efficient spatial resolution for observing Si(111) surface at atomic resolution. We performed an in situ experiment with STM and XMCD spectroscopy on Co nanoclusters on an Au(111) surface and explored its practical application to investigate magnetic properties for well-characterized nanoscale magnetic materials.

Ueno, Tetsuro; Sawada, Masahiro; Namatame, Hirofumi [Hiroshima Synchrotron Radiation Center, Hiroshima University, 2-313 Kagamiyama, Higashi-Hiroshima 739-0046 (Japan); Kishimizu, Yusuke; Kimura, Akio [Graduate School of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); Taniguchi, Masaki [Hiroshima Synchrotron Radiation Center, Hiroshima University, 2-313 Kagamiyama, Higashi-Hiroshima 739-0046 (Japan); Graduate School of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan)

2012-12-15T23:59:59.000Z

168

Scanning-tunneling-microscopy investigation of the p(22) and c(22) overlayers of S on Ni(100)  

Science Journals Connector (OSTI)

The p(22) and c(22) sulfur overlayers on Ni(100), and the clean Ni(100) surface itself, have been imaged in an ultrahigh-vacuum scanning tunneling microscope, and topographic and spectroscopic information was obtained from all three surfaces. These data are compared to theoretical calculations of the surfaces derived using the Greens-function method of Pendry, Pretre, and Krutzen, where the sample Greens function is calculated in a multiple-scattering formalism based on the layer Korringa-Kohn-Rostoker method. Our simple model has proved reasonably successful in predicting the corrugation heights observed on the sulfated nickel surfaces, and confirmed the fact that the difference in height observed between the p(22) and the c(22) phases is electronic in origin. It is also proposed that the enhanced corrugation observed on the clean nickel surface may in part be attributable to the presence of a magnetic surface state immediately below the Fermi energy. Attempts to model the I-V and dI/dV spectroscopy curves proved less successful but it is believed that this was largely attributable to the approximations used in the present calculation.

A. Partridge; G. J. Tatlock; F. M. Leibsle; C. F. J. Flipse; G. Hrmandinger; J. B. Pendry

1993-09-15T23:59:59.000Z

169

Chemical Imaging Analysis of Environmental Particles Using the Focused Ion Beam/Scanning Electron Microscopy Technique: Microanalysis Insights into Atmospheric Chemistry of Fly Ash  

SciTech Connect

Airborne fly ash from coal combustion may represent a source of bioavailable iron (Fe) in the open ocean. However, few studies have been made focusing on Fe speciation and distribution in coal fly ash. In this study, chemical imaging of fly ash has been performed using a dual-beam FIB/SEM (focused ion beam/scanning electron microscope) system for a better understanding of how simulated atmospheric processing modify the morphology, chemical compositions and element distributions of individual particles. A novel approach has been applied for cross-sectioning of fly ash specimen with a FIB in order to explore element distribution within the interior of individual particles. Our results indicate that simulated atmospheric processing causes disintegration of aluminosilicate glass, a dominant material in fly ash particles. Aluminosilicate-phase Fe in the inner core of fly ash particles is more easily mobilized compared with oxide-phase Fe present as surface aggregates on fly ash spheres. Fe release behavior depends strongly on Fe speciation in aerosol particles. The approach for preparation of cross-sectioned specimen described here opens new opportunities for particle microanalysis, particular with respect to inorganic refractive materials like fly ash and mineral dust.

Chen, Haihan; Grassian, Vicki H.; Saraf, Laxmikant V.; Laskin, Alexander

2013-01-21T23:59:59.000Z

170

Ultrafast supercontinuum fiber-laser based pump-probe scanning magneto-optical Kerr effect microscope for the investigation of electron spin dynamics in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution  

SciTech Connect

We describe a two-color pump-probe scanning magneto-optical Kerr effect microscope which we have developed to investigate electron spin phenomena in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution. The key innovation of our microscope is the usage of an ultrafast white light supercontinuum fiber-laser source which provides access to the whole visible and near-infrared spectral range. Our Kerr microscope allows for the independent selection of the excitation and detection energy while avoiding the necessity to synchronize the pulse trains of two separate picosecond laser systems. The ability to independently tune the pump and probe wavelength enables the investigation of the influence of excitation energy on the optically induced electron spin dynamics in semiconductors. We demonstrate picosecond real-space imaging of the diffusive expansion of optically excited electron spin packets in a (110) GaAs quantum well sample to illustrate the capabilities of the instrument.

Henn, T.; Kiessling, T., E-mail: tobias.kiessling@physik.uni-wuerzburg.de; Ossau, W.; Molenkamp, L. W. [Physikalisches Institut (EP3), Universitt Wrzburg, 97074 Wrzburg (Germany)] [Physikalisches Institut (EP3), Universitt Wrzburg, 97074 Wrzburg (Germany); Biermann, K.; Santos, P. V. [Paul-Drude-Institut fr Festkrperelektronik, 10117 Berlin (Germany)] [Paul-Drude-Institut fr Festkrperelektronik, 10117 Berlin (Germany)

2013-12-15T23:59:59.000Z

171

Scanning tuneeling microscopy studies of fivefold surfaces of icosahedral Al-Pd-Mn quasicrystals and of thin silver films on those surfaces  

SciTech Connect

The present work in this dissertation mainly focuses on the clean fivefold surfaces of i-Al-Pd-Mn quasicrystals as well as the nucleation and growth of Ag films on these surfaces. In addition, Ag film growth on NiAl(110) has been explored in the frame of this dissertation. First, we have investigated the equilibration of a fivefold surface of icosahedral Al-Pd-Mn quasicrystal at 900-915 K and 925-950 K, using Omicron variable temperature scanning tunneling microscope (STM). Annealing at low temperatures resulted in many voids on some terraces while the others were almost void-free. After annealing at 925-950K, void-rich terraces became much rarer. Our STM images suggest that through growth and coalescence of the voids, a different termination becomes exposed on host terraces. All of these observations in our study indicate that even after the quasicrystalline terrace-step structure appears, it evolves with time and temperature. More specifically, based on the STM observations, we conclude that during the annealing a wide range of energetically similar layers nucleate as surface terminations, however, with increasing temperature (and time) this distribution gets narrower via elimination of the metastable void-rich terraces. Next, we have examined the bulk structural models of icosahedral Al-Pd-Mn quasicrystal in terms of the densities, compositions and interplanar spacings for the fivefold planes that might represent physical surface terminations. In our analyses, we mainly have focused on four deterministic models which have no partial or mixed occupancy but we have made some comparisons with an undeterministic model. We have compared the models with each other and also with the available experimental data including STM, LEED-IV, XPD and LEIS. In all deterministic models, there are two different families of layers (a pair of planes), and the nondeterministic model contains similar group of planes. These two families differ in terms of the chemical decoration of their top planes. Hence, we name them as Pd+(with Pd) and Pd-(without Pd). Based on their planer structure and the step height, it can be said that these two families can be viable surface terminations. However, besides the Pd content, these two sets differ in terms of relative densities of their top planes as well as the gap separating the layer from the nearest atomic plane. The experimental data and other arguments lead to the conclusion that the Pd- family is favored over the Pd+. This has an important implication on the interpretation of local motifs seen in the high resolution STM images. In other words, the dark stars are not formed by cut-Bergmans rather they are formed by cut-Mackays.

Unal, Baris

2008-12-01T23:59:59.000Z

172

Probing Structure-Property Relationship of Energy Storage Materials Using Ex-Situ, In-Situ Dynamic Microscopy and Spectroscopy with High Spatial and Fast Temporal Resolution  

E-Print Network (OSTI)

Probing Structure-Property Relationship of Energy Storage Materials Using Ex-Situ, In-Situ Dynamic, chemistry, and properties of energy storage materials Find general guiding principle for accelerated-situ chemical imaging and spectroscopic study of structure and chemical evolution of new energy storage

173

Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique  

Science Journals Connector (OSTI)

......prepared by consolidation of amorphous powders in the supercooled liquid region. Intermetallics (2004) 12:1109-1113. 6 Overwijk M H F , Van Den Heuvel F C, Bulle-Lieuwma C W T. Novel scheme for the preparation of transmission electron microscopy specimens......

Pyuck-Pa Choi; Young-Soon Kwon; Ji-Soon Kim; Tala?at Al-Kassab

2007-04-01T23:59:59.000Z

174

A New Interpretation of the Scanning Tunneling Microscope Image...  

NLE Websites -- All DOE Office Websites (Extended Search)

of Graphite. A New Interpretation of the Scanning Tunneling Microscope Image of Graphite. Abstract: In this work, highly-resolved scanning tunneling microscopy images of graphite...

175

TiO2 Nanoparticles as a Soft X-ray Molecular Probe  

SciTech Connect

With the emergence of soft x-ray techniques for imaging cells, there is a pressing need to develop protein localization probes that can be unambiguously identified within the region of x-ray spectrum used for imaging. TiO2 nanocrystal colloids, which have a strong absorption cross-section within the "water-window" region of x-rays, areideally suited as soft x-ray microscopy probes. To demonstrate their efficacy, TiO2-streptavidin nanoconjugates were prepared and subsequently labeled microtubules polymerized from biotinylated tubulin. The microtubules were imaged using scanning transmission x-ray microscopy (STXM), and the TiO2 nanoparticle tags were specifically identified using x-ray absorption near edge spectroscopy (XANES). These experiments demonstrate that TiO2 nanoparticles are potential probes for protein localization analyses using soft x-ray microscopy.

Larabell, Carolyn; Ashcroft, Jared M.; Gu, Weiwei; Zhang, Tierui; Hughes, Steven M.; Hartman, Keith B.; Hofmann, Cristina; Kanaras, Antonios G.; Kilcoyne, David A.; Le Gros, Mark; Yin, Yadong; Alivisatos, A. Paul; Larabell, Carolyn A.

2007-06-30T23:59:59.000Z

176

katherine henderson Pathology Slide Scanning rev1 Page 1 10/21/14 Scanning in Pathology  

E-Print Network (OSTI)

katherine henderson Pathology Slide Scanning rev1 Page 1 10/21/14 Scanning in Pathology Pathology offers several scanning methods: · Whole slide scans to be used as virtual microscopy ­ Aperio Coolscan for 35mm slides or glass slides with adapter (scans tissue area, not cells) The above scanners

177

High-resolution scanning transmission electron microscopy  

Science Journals Connector (OSTI)

...where, is the brightness of the source and bs/80 is the ratio of the real image of the...im-age (0.61A/a). The quantity bs/80 can be most easily defined in the source...tube can be ac-quired at a reasonable cost and is com-patible with full-color displays...

AV Crewe

1983-07-22T23:59:59.000Z

178

Scanning tunnelling microscopy of carbon nanotubes  

Science Journals Connector (OSTI)

...sheet into a cylinder where the car- bon lattice is joined seamlessly...consist of at least a pair of defective rings, e.g. squares, pentagons...sized (Meunier et al. 1999), defective (Meunier & Lambin 1998, 2000...Blase, X., Devita, A. & Car, R. 1997 Electronic structure...

2004-01-01T23:59:59.000Z

179

Cryogenic UHV installation for scanning tunneling microscopy  

Science Journals Connector (OSTI)

In this work we describe a helium cryostat with an ultrahigh vacuum chamber for placing the STM [H. By means of this installation it is possible to perform sample treatmentin situ (breaking, annealing, ion etchin...

V. S. Edelman; I. N. Khlyustikov

1996-01-01T23:59:59.000Z

180

Dynamic Transmission Electron Microscopy  

SciTech Connect

Dynamic transmission electron microscopy (DTEM) combines the benefits of high spatial resolution electron microscopy with the high temporal resolution of ultrafast lasers. The incorporation of these two components into a single instrument provides a perfect platform for in situ observations of material processes. However, previous DTEM applications have focused on observing structural changes occurring in samples exposed to high vacuum. Therefore, in order to expand the pump-probe experimental regime to more natural environmental conditions, in situ gas and liquid chambers must be coupled with Dynamic TEM. This chapter describes the current and future applications of in situ liquid DTEM to permit time-resolved atomic scale observations in an aqueous environment, Although this chapter focuses mostly on in situ liquid imaging, the same research potential exists for in situ gas experiments and the successful integration of these techniques promises new insights for understanding nanoparticle, catalyst and biological protein dynamics with unprecedented spatiotemporal resolution.

Evans, James E.; Jungjohann, K. L.; Browning, Nigel D.

2012-10-12T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


181

Scanned probe characterization of semiconductor nanostructures  

E-Print Network (OSTI)

of the window and wing region of the aplane GaN film,? m thick GaN film was then grown through the windows in thewindow regions, lateral overgrowth over the dielectric mask, and coalescence of the film

Law, James Jeremy MacDonald

2009-01-01T23:59:59.000Z

182

Scanning Probe AFM Compound Microscope | EMSL  

NLE Websites -- All DOE Office Websites (Extended Search)

reveal that significant charge-transfer occurs between atoms... Atomistic simulation of CdTe solid-liquid coexistence equilibria. Atomistic simulations of CdTe using a...

183

Electron microscopy and microanalysis Two transmission electron microscopes  

E-Print Network (OSTI)

Electron microscopy and microanalysis Two transmission electron microscopes (TEM) and three scanning electron micro- scopes (SEM) are operated by the De- partment. Attachments for TEM include energy dispersive X-ray spectrometer (EDS), scanning transmission attachment, serial electron energy loss

184

Magnetic Force Between Magnetic Nano Probes at Optical Frequency  

E-Print Network (OSTI)

Magnetic force microscopy based on the interaction of static magnetic materials was demonstrated in the past with resolutions in the order of nanometers. Measurement techniques based on forces between electric dipoles oscillating at optical frequencies have been also demonstrated leading to the standard operation of the scanning force microscope (SFM). However the investigations of a SFM based on the magnetic force generated by magnetic dipole moments oscillating at optical frequencies has not been tackled yet. With this goal in mind we establish a theoretical model towards observable magnetic force interaction between two magnetically polarizable nanoparticles at optical frequency and show such a force to be in the order of piconewtons which could be in principle detected by conventional microscopy techniques. Two possible principles for conceiving magnetically polarizable nano probes able to generate strong magnetic dipoles at optical frequency are investigated based on silicon nanoparticles and on clusters...

Guclu, Caner; Capolino, Filippo

2014-01-01T23:59:59.000Z

185

Free motion scanning system  

DOE Patents (OSTI)

The present invention relates to an ultrasonic scanner system and method for the imaging of a part system, the scanner comprising: a probe assembly spaced apart from the surface of the part including at least two tracking signals for emitting radiation and a transmitter for emitting ultrasonic waves onto a surface in order to induce at least a portion of the waves to be reflected from the part, at least one detector for receiving the radiation wherein the detector is positioned to receive the radiation from the tracking signals, an analyzer for recognizing a three-dimensional location of the tracking signals based on the emitted radiation, a differential converter for generating an output signal representative of the waveform of the reflected waves, and a device such as a computer for relating said tracking signal location with the output signal and projecting an image of the resulting data. The scanner and method are particularly useful to acquire ultrasonic inspection data by scanning the probe over a complex part surface in an arbitrary scanning pattern.

Sword, Charles K. (Pleasant Hills, PA)

2000-01-01T23:59:59.000Z

186

Optical Microscopy and 4Optical Microscopy and 4 Pi MicroscopyPi Microscopy  

E-Print Network (OSTI)

Optical Microscopy and 4Optical Microscopy and 4 Pi MicroscopyPi Microscopy Carolyn A. SuttonCarolyn A. Sutton PH 464PH 464 #12;OverviewOverview The OpticalThe Optical MicroscopeMicroscopy 4 Pi Microscopy4 Pi Microscopy Optical Microscope for Metallography #12;Optical Microscope: OriginsOptical

La Rosa, Andres H.

187

Probing the Degradation Mechanisms in Electrolyte Solutions for...  

NLE Websites -- All DOE Office Websites (Extended Search)

Degradation Mechanisms in Electrolyte Solutions for Li-ion Batteries by In-Situ Transmission Electron Microscopy. Probing the Degradation Mechanisms in Electrolyte Solutions for...

188

Mapping Ionic Currents and Reactivity on the Nanoscale: Electrochemical Strain Microscopy  

SciTech Connect

Solid-state electrochemical processes in oxides underpin a broad spectrum of energy and information storage devices, ranging from Li-ion and Li-air batteries, to solid oxide fuel cells (SOFC) to electroresistive and memristive systems. These functionalities are controlled by the bias-driven diffusive and electromigration transport of mobile ionic species, as well as intricate a set of electrochemical and defect-controlled reactions at interfaces and in bulk. Despite the wealth of device-level and atomistic studies, little is known on the mesoscopic mechanisms of ion diffusion and electronic transport on the level of grain clusters, individual grains, and extended defects. The development of the capability for probing ion transport on the nanometer scale is a key to deciphering complex interplay between structure, functionality, and performance in these systems. Here we introduce Electrochemical Strain Microscopy, a scanning probe microscopy technique based on strong strain-bias coupling in the systems in which local ion concentrations are changed by electrical fields. The imaging capability, as well as time- and voltage spectroscopies analogous to traditional current based electrochemical characterization methods are developed. The reversible intercalation of Li and mapping electrochemical activity in LiCoO2 is demonstrated, illustrating higher Li diffusivity at non-basal planes and grain boundaries. In Si-anode device structure, the direct mapping of Li diffusion at extended defects and evolution of Li-activity with charge state is explored. The electrical field-dependence of Li mobility is studied to determine the critical bias required for the onset of electrochemical transformation, allowing reaction and diffusion processes in the battery system to be separated at each location. Finally, the applicability of ESM for probing oxygen vacancy diffusion and oxygen reduction/evolution reactions is illustrated, and the high resolution ESM maps are correlated with aberration corrected scanning transmission electron microscopy imaging. The future potential for deciphering mechanisms of electrochemical transformations on an atomically-defined single-defect level is discussed.

Kalinin, S.V. (Center for Nanophase Materials Sciences, ORNL) [Center for Nanophase Materials Sciences, ORNL

2010-10-19T23:59:59.000Z

189

Electron Microscopy | Center for Functional Nanomaterials  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Facility Electron Microscopy Facility Electron Microscopy This facility consists of four top-of-the line transmission electron microscopes, two of which are highly specialized instruments capable of extreme levels of resolution, achieved through spherical aberration correction. The facility is also equipped with extensive sample-preparation capabilities. The scientific interests of the staff focus on understanding the microscopic origin of the physical and chemical behavior of materials, with specific emphasis on in-situ studies of materials in native, functional environments. Capabilities Atomic-resolution imaging of internal materials structure with scanning transmission and transmission electron microscopy Spectroscopic characterization with energy dispersive x-ray

190

A near-field scanning microwave microscope based on a superconducting resonator for low power measurements  

E-Print Network (OSTI)

We report on the design and performance of a cryogenic (300 mK) near-field scanning microwave microscope. It uses a microwave resonator as the near-field sensor, operating at a frequency of 6 GHz and microwave probing amplitudes down to 100 uV, approaching low enough photon population (N~1000) of the resonator such that coherent quantum manipulation becomes feasible. The resonator is made out of a miniaturized distributed fractal superconducting circuit that is integrated with the probing tip, micromachined to be compact enough such that it can be mounted directly on a quartz tuning-fork, and used for parallel operation as an atomic force microscope (AFM). The resonator is magnetically coupled to a transmission line for readout, and to achieve enhanced sensitivity we employ a Pound-Drever-Hall measurement scheme to lock to the resonance frequency. We achieve a well localized near-field around the tip such that the microwave resolution is comparable to the AFM resolution, and a capacitive sensitivity down to 6.4x10^-20 F/rtHz, limited by mechanical noise. We believe that the results presented here are a significant step towards probing quantum systems at the nanoscale using near-field scanning microwave microscopy.

S. E. de Graaf; A. V. Danilov; A. Adamyan; S. E. Kubatkin

2014-04-02T23:59:59.000Z

191

Feature Article NEXAFS microscopy and resonant scattering  

E-Print Network (OSTI)

and conven- tional electron, X-ray and neutron scattering. We provide an overview of these synchrotron based and derivative struc- tures, ranging from spectroscopy to mechanical analysis and neutron scattering [9,10]. SomeFeature Article NEXAFS microscopy and resonant scattering: Composition and orientation probed

Hitchcock, Adam P.

192

E-Print Network 3.0 - absorption spectroscopic microscopy Sample...  

NLE Websites -- All DOE Office Websites (Extended Search)

version of scanning near-field optical microscopy (SNOM). The tunable infrared radiation... the l 3.5 mm, CH vibrational stretch mode absorption band. ... Source:...

193

Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy  

SciTech Connect

The authors present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.

Schwarz, Udo; Albers, Boris J.; Liebmann, Marcus; Schwendemann, Todd C.; Baykara, Mehmet Z.; Heyde, Markus; Salmeron, Miquel; Altman, Eric I.; Schwarz, Udo D.

2008-02-27T23:59:59.000Z

194

SCANNING ACOUSTIC MICROSCOPY MODELING FOR MICROMECHANICAL MEASUREMENTS OF COMPLEX SUBSTRATES  

E-Print Network (OSTI)

function of the substrate-fluid interface form the two key problems of effective SAM modeling. In the SAM modeling literature, a variety of approaches have been proposed for evaluating Eq 2.1. The approaches most frequently adopted are founded either... 1973). As seen from Eq 2.1, the evaluation of the reflected pressure field requires the computation of the angular spectrum and reflectance function. In general, these quantities can be computed independently. For angular spectrum calculation we...

Marangos, Orestes

2010-05-31T23:59:59.000Z

195

Fluorescence resonance energy transfer scanning near-field optical microscopy  

Science Journals Connector (OSTI)

...and applications. New York: Wiley Interscience...Fluorescence resonance energy transfer SNOM 919...fluorescence resonance energy transfer source...Electromagnetic theory. New York: McGraw-Hill...hierarchy and directed energy transfer in conjugated...

2004-01-01T23:59:59.000Z

196

DISLOCATION IMAGES IN HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY  

E-Print Network (OSTI)

. There are several dislocation images in the back scattered mode which are distinctly of excess/defect contrast observed in the dark field : two seperate conditions cars. be found. There is a set of dislocations having

Paris-Sud XI, Université de

197

Scanning Electron Microscopy in Concrete Petrography Paul E. Stutzman  

E-Print Network (OSTI)

hydroxide, needle-like habit of ettringite, and the sheet-like habit of calcium- silicate I C-S-H, platy-Type II C-S-H, and ettringite needles. Calcium Hydroxide Ettringite Calcium Hydroxide Ettringite Calcium-Silicate-Hydrate 15 µµm 10 µµm #12;#12;Calcium Hydroxide in Concrete 63 Figure 2

Bentz, Dale P.

198

Oscillating String as a Force Sensor in Scanning Force Microscopy  

Science Journals Connector (OSTI)

We present a sensor that uses an oscillating string to detect forces. A cantilever beam serves as a sample stage. The string is attached to the free end of ... the free end of the beam modifies the string tension...

A. Stalder; U. Drig

1995-01-01T23:59:59.000Z

199

Atom Probe Tomography | EMSL  

NLE Websites -- All DOE Office Websites (Extended Search)

Atom Probe Tomography Atom Probe Tomography The LEAP 4000 XHR local electrode atom probe tomography instrument enabled the first-ever comprehensive and accurate 3-D chemical...

200

SUBMOLECULAR IMAGING OF EPITAXIALLY CRYSTALLIZED HELICAL POLYOLEFINS BY ATOMIC FORCE MICROSCOPY  

E-Print Network (OSTI)

Digital Instruments, Inc., Santa Barbara, Cal. USA. Images were taken with an A­type scan head (max. scan microscopy EM and electron diffraction ED. AFM pictures with high resolution could be obtained when using polypropylene has been determined by electron microscopy EM and electron diffraction ED: chain conformation

Peters, Achim

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


201

Scanning evanescent electro-magnetic microscope  

DOE Patents (OSTI)

A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

Xiang, Xiao-Dong (Alameda, CA); Gao, Chen (Alameda, CA)

2001-01-01T23:59:59.000Z

202

Preparation of TiO2(110)-(1x1) Surface via UHV Cleavage: An scanning...  

NLE Websites -- All DOE Office Websites (Extended Search)

Preparation of TiO2(110)-(1x1) Surface via UHV Cleavage: An scanning tunneling microscopy study. Preparation of TiO2(110)-(1x1) Surface via UHV Cleavage: An scanning tunneling...

203

High resolution, high speed ultrahigh vacuum microscopy  

SciTech Connect

The history and future of transmission electron microscopy (TEM) is discussed as it refers to the eventual development of instruments and techniques applicable to the real time in situ investigation of surface processes with high resolution. To reach this objective, it was necessary to transform conventional high resolution instruments so that an ultrahigh vacuum (UHV) environment at the sample site was created, that access to the sample by various in situ sample modification procedures was provided, and that in situ sample exchanges with other integrated surface analytical systems became possible. Furthermore, high resolution image acquisition systems had to be developed to take advantage of the high speed imaging capabilities of projection imaging microscopes. These changes to conventional electron microscopy and its uses were slowly realized in a few international laboratories over a period of almost 40 years by a relatively small number of researchers crucially interested in advancing the state of the art of electron microscopy and its applications to diverse areas of interest; often concentrating on the nucleation, growth, and properties of thin films on well defined material surfaces. A part of this review is dedicated to the recognition of the major contributions to surface and thin film science by these pioneers. Finally, some of the important current developments in aberration corrected electron optics and eventual adaptations to in situ UHV microscopy are discussed. As a result of all the path breaking developments that have led to today's highly sophisticated UHV-TEM systems, integrated fundamental studies are now possible that combine many traditional surface science approaches. Combined investigations to date have involved in situ and ex situ surface microscopies such as scanning tunneling microscopy/atomic force microscopy, scanning Auger microscopy, and photoemission electron microscopy, and area-integrating techniques such as x-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, Auger electron spectroscopy, low-energy electron diffraction, temperature programmed desorption, high-resolution electron energy-loss and Fourier-transform infrared spectroscopies, and others. Material systems ranging from atomic layers of metals and semiconductors to biology related depositions are being investigated. In the case of biological materials, however, strict limitations to high-resolution applications are imposed by electron radiation damage considerations.

Poppa, Helmut [National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)

2004-09-01T23:59:59.000Z

204

An investigation of receiver probe development for magnetic resonance microscopy  

E-Print Network (OSTI)

to have only a z component that is spherically symmetric and, thus, varies only in r by the relation A = A(F) . pont source i = vector from ortgin to obscuvauou pont FIG. 2. 2. Point source at origin with relation to coordinates. 14 Equation [2... to have only a z component that is spherically symmetric and, thus, varies only in r by the relation A = A(F) . pont source i = vector from ortgin to obscuvauou pont FIG. 2. 2. Point source at origin with relation to coordinates. 14 Equation [2...

Boyer, Jeffrey Scott

2012-06-07T23:59:59.000Z

205

Chemical Force Microscopy Nanoscale Probing of Fundamental Chemical Interactions  

Science Journals Connector (OSTI)

Intermolecular forces impact a wide spectrum of problems in condensed phases: from molecular recognition, self-assembly, and protein folding at the molecular and nanometer scale, to interfacial fracture, frict...

Aleksandr Noy; Dmitry V. Vezenov

2008-01-01T23:59:59.000Z

206

Scanning probe characterization of novel semiconductor materials and devices  

E-Print Network (OSTI)

surf where q is the fundamental electronic charge magnitude,m * , where q is the fundamental electronic charge and m *

Zhou, Xiaotian

2007-01-01T23:59:59.000Z

207

Untitled Document  

NLE Websites -- All DOE Office Websites (Extended Search)

Digital Instruments Scanning Probe Microscopy with AFM capabilties and Hysitron Nano Indenter Back to Equipment...

208

Three-dimensional Chemical Imaging of Embedded Nanoparticles using Atom Probe Tomography  

SciTech Connect

Analysis of nanoparticles is often challenging especially when they are embedded in a matrix. Hence, we have used laser-assisted atom probe tomography (APT) to analyze the Au-nanoclusters synthesized in situ using ion beam implantation in single crystal MgO matrix. APT analysis along with scanning transmission electron microscopy and energy dispersive spectroscopy (STEM-EDS) indicated that the nanoparticles have an average size ~ 8 - 12 nm. While it is difficult to analyze the composition of individual nanoparticles using STEM, APT analysis can give three dimensional compositions of the same. It was shown that the maximum Au-concentration in the nanoparticles increases with increasing particle size, with a maximum Au-concentration of up to 50%.

Kuchibhatla, Satyanarayana V N T; Shutthanandan, V.; Prosa, Ty J.; Adusumilli, Praneet; Arey, Bruce W.; Buxbaum, Alex; Wang, Y. C.; Tessner, Ted; Ulfig, Robert M.; Wang, Chong M.; Thevuthasan, Suntharampillai

2012-05-03T23:59:59.000Z

209

Fiber optic probe of free electron evanescent fields in the optical frequency range  

SciTech Connect

We introduce an optical fiber platform which can be used to interrogate proximity interactions between free-electron evanescent fields and photonic nanostructures at optical frequencies in a manner similar to that in which optical evanescent fields are sampled using nanoscale aperture probes in scanning near-field microscopy. Conically profiled optical fiber tips functionalized with nano-gratings are employed to couple electron evanescent fields to light via the Smith-Purcell effect. We demonstrate the interrogation of medium energy (3050?keV) electron fields with a lateral resolution of a few micrometers via the generation and detection of visible/UV radiation in the 700300?nm (free-space) wavelength range.

So, Jin-Kyu, E-mail: js1m10@orc.soton.ac.uk; MacDonald, Kevin F. [Optoelectronics Research Centre and Centre for Photonic Metamaterials, University of Southampton, Highfield, Southampton SO17 1BJ (United Kingdom); Zheludev, Nikolay I. [Optoelectronics Research Centre and Centre for Photonic Metamaterials, University of Southampton, Highfield, Southampton SO17 1BJ (United Kingdom); Centre for Disruptive Photonic Technologies, Nanyang Technological University, Singapore 637371 (Singapore)

2014-05-19T23:59:59.000Z

210

Center for Understanding and Control of Acid Gas-induced Evolution...  

Office of Science (SC) Website

and scattering, electron microscopy, scanning probe microscopy, surface science, neutron diffraction and scattering, molecular dynamics (MD), density functional theory...

211

Indentation of a Punch with Chemical or Heat Distribution at Its Base into Transversely Isotropic Half-Space: Application to Local Thermal and Electrochemical Probes  

SciTech Connect

The exact solution to the coupled problem of indentation of the punch, subjected to either heat or chemical substance distribution at its base, into three-dimensional semi-infinite transversely isotropic material is presented. The entire set of field components are derived in terms of integrals of elementary functions using methods of the potential theory and recently obtained, by the authors, results for the general solution of the field equations in terms of four harmonic potential functions. The exact solution for the stiffness relations that relate applied force, total chemical diffusion/heat flux in the domain of the contact, with indenter displacement, temperature, or chemical substance distribution of diffusing species at the base, and materials' chemo/thermo-elastic properties are obtained in closed form and in terms of elementary functions. These results can be used to understand the image formation mechanisms in techniques such as thermal scanning probe microscopy and electrochemical strain microscopy

Karapetian, E. [Suffolk University, Boston; Kalinin, Sergei V [ORNL

2013-01-01T23:59:59.000Z

212

Scanning ARM Cloud Radars Part I: Operational Sampling Strategies  

SciTech Connect

Probing clouds in three-dimensions has never been done with scanning millimeter-wavelength (cloud) radars in a continuous operating environment. The acquisition of scanning cloud radars by the Atmospheric Radiation Measurement (ARM) program and research institutions around the world generate the need for developing operational scan strategies for cloud radars. Here, the first generation of sampling strategies for the Scanning ARM Cloud Radars (SACRs) is discussed. These scan strategies are designed to address the scientific objectives of the ARM program, however, they introduce an initial framework for operational scanning cloud radars. While the weather community uses scan strategies that are based on a sequence of scans at constant elevations, the SACRs scan strategies are based on a sequence of scans at constant azimuth. This is attributed to the cloud properties that are vastly different for rain and snow shafts that are the primary target of precipitation radars. A cloud surveillance scan strategy is introduced (HS-RHI) based on a sequence of horizon-to-horizon Range Height Indicator (RHI) scans that sample the hemispherical sky (HS). The HS-RHI scan strategy is repeated every 30 min to provide a static view of the cloud conditions around the SACR location. Between HS-RHI scan strategies other scan strategies are introduced depending on the cloud conditions. The SACRs are pointing vertically in the case of measurable precipitation at the ground. The radar reflectivities are corrected for water vapor attenuation and non-meteorological detection are removed. A hydrometeor detection mask is introduced based on the difference of cloud and noise statistics is discussed.

Kollias, Pavlos; Bharadwaj, Nitin; Widener, Kevin B.; Jo, Ieng; Johnson, Karen

2014-03-01T23:59:59.000Z

213

Nonlinear vibrational microscopy  

DOE Patents (OSTI)

The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. Microscopic imaging with a vibrational spectroscopic contrast is achieved by generating signals in a nonlinear optical process and spatially resolved detection of the signals. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a. directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b. collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c. removing the residual beam; and d. detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution then IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers. CARS and SFG microscopy does not rely on the presence of fluorophores, but retains the resolution and three-dimensional sectioning capability of confocal and two-photon fluorescence microscopy. Complementary to these techniques, CARS and SFG microscopy provides a contrast mechanism based on vibrational spectroscopy. This vibrational contrast mechanism, combined with an unprecedented high sensitivity at a tolerable laser power level, provides a new approach for microscopic investigations of chemical and biological samples.

Holtom, Gary R. (Richland, WA); Xie, Xiaoliang Sunney (Richland, WA); Zumbusch, Andreas (Munchen, DE)

2000-01-01T23:59:59.000Z

214

Materials Applications of Photoelectron Emission Microscopy....  

NLE Websites -- All DOE Office Websites (Extended Search)

Applications of Photoelectron Emission Microscopy. Materials Applications of Photoelectron Emission Microscopy. Abstract: Photoelectron emission microscopy (PEEM) is a versatile...

215

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Acknowledgment Acknowledgment EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Acknowledgment Please acknowledge your use of the EMC in your publications and presentations with the following acknowledgment statement: The electron microscopy was accomplished at the Electron Microscopy Center at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC.

216

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

SAMM SAMM EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Sub-Ångstrom Microscopy and Microanalysis Facility In order to meet the scientific challenges of the future, the EMC has built a new state-of-the-art laboratory space for advanced electron microscopy. The new building has been designed to provide next- generation science with an operating environment that cannot be attained by renovating existing facilities. The EMC staff learned as much as possible from similar efforts around the world, including the SuperSTEM building at Daresbury, the Triebenberg Special Laboratory, the AML at Oak Ridge National Laboratory, the new NIST building, and various facilities for nanoscience.

217

Nano-scale optical and electrical probes of materials and processes.  

SciTech Connect

This report describes the investigations and milestones of the Nano-Scale Optical and Electrical Probes of Materials and Processes Junior/Senior LDRD. The goal of this LDRD was to improve our understanding of radiative and non-radiative mechanisms at the nanometer scale with the aim of increasing LED and solar cell efficiencies. These non-radiative mechanisms were investigated using a unique combination of optical and scanning-probe microscopy methods for surface, materials, and device evaluation. For this research we utilized our new near-field scanning optical microscope (NSOM) system to aid in understanding of defect-related emission issues for GaN-based materials. We observed micrometer-scale variations in photoluminescence (PL) intensity for GaN films grown on Cantilever Epitaxy pattern substrates, with lower PL intensity observed in regions with higher dislocation densities. By adding electrical probes to the NSOM system, the photocurrent and surface morphology could be measured concurrently. Using this capability we observed reduced emission in InGaN MQW LEDs near hillock-shaped material defects. In spatially- and spectrally-resolved PL studies, the emission intensity and measured wavelength varied across the wafer, suggesting the possibility of indium segregation within the InGaN quantum wells. Blue-shifting of the InGaN MQW wavelength due to thinning of quantum wells was also observed on top of large-scale ({micro}m) defect structures in GaN. As a direct result of this program, we have expanded the awareness of our new NSOM/multifunctional SPM capability at Sandia and formed several collaborations within Sandia and with NINE Universities. Possible future investigations with these new collaborators might include GaN-based compound semiconductors for green LEDs, nanoscale materials science, and nanostructures, novel application of polymers for OLEDs, and phase imprint lithography for large area 3D nanostructures.

Bogart, Katherine Huderle Andersen

2007-03-01T23:59:59.000Z

218

Hydrodynamic ultrasonic probe  

DOE Patents (OSTI)

An improved probe for in-service ultrasonic inspection of long lengths of a workpiece, such as small diameter tubing from the interior. The improved probe utilizes a conventional transducer or transducers configured to inspect the tubing for flaws and/or wall thickness variations. The probe utilizes a hydraulic technique, in place of the conventional mechanical guides or bushings, which allows the probe to move rectilinearly or rotationally while preventing cocking thereof in the tube and provides damping vibration of the probe. The probe thus has lower friction and higher inspection speed than presently known probes.

Day, Robert A. (Livermore, CA); Conti, Armond E. (San Jose, CA)

1980-01-01T23:59:59.000Z

219

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites

Laboratory Laboratory Electron Microscopy Center Argonne Home > EMC > EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

220

Microscopy. I: A Review  

Science Journals Connector (OSTI)

...indicates the spindle to be an orienting force through which a co-ordinated con tractile...asoT,E. M. and M@&soN,C. W. Handbook of Chemi cal Microscopy. Vol. 1. 1st...498 "586,1950. 164. NAORA, H. Fundamental Studies on the Determination of Desoxypentose-Nucleic...

Robert C. Mellors

1953-02-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


221

Morphological properties of pillared layered materials investigated by electron microscopy technique  

E-Print Network (OSTI)

Scanning electron microscopy was used to investigate morphological features of a diverse range of pillared layered materials. Pillared layered zirconium phosphates, zirconium polyimine phosphonates and anion exchanger derivatives, zinc...

Navas de Mascianglioli, Margarit

2012-06-07T23:59:59.000Z

222

Thermal expansion recovery microscopy: Practical design considerations  

SciTech Connect

A detailed study of relevant parameters for the design and operation of a photothermal microscope technique recently introduced is presented. The technique, named thermal expansion recovery microscopy (ThERM) relies in the measurement of the defocusing introduced by a surface that expands and recovers upon the heating from a modulated source. A new two lens design is presented that can be easily adapted to commercial infinite conjugate microscopes and the sensitivity to misalignment is analyzed. The way to determine the beam size by means of a focus scan and the use of that same scan to verify if a thermoreflectance signal is overlapping with the desired ThERM mechanism are discussed. Finally, a method to cancel the thermoreflectance signal by an adequate choice of a nanometric coating is presented.

Mingolo, N., E-mail: nmingol@fi.uba.ar; Martnez, O. E. [Facultad de Ingeniera, Universidad de Buenos Aires, Paseo Colon 850, 1063 Buenos Aires (Argentina)] [Facultad de Ingeniera, Universidad de Buenos Aires, Paseo Colon 850, 1063 Buenos Aires (Argentina)

2014-01-15T23:59:59.000Z

223

Characterization of adsorbates by2 transient measurements in Scanning3  

E-Print Network (OSTI)

1 1 Characterization of adsorbates by2 transient measurements in Scanning3 Electrochemical electrochemical microscopy in2 transient mode allows the investigation of adsorbate intermediates at a polarized3 measurement of the electrochemical6 impedance allowed the complex differential capacitance for each adsorbed

Boyer, Edmond

224

Vector generator scan converter  

DOE Patents (OSTI)

High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardware for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold. 7 figs.

Moore, J.M.; Leighton, J.F.

1988-02-05T23:59:59.000Z

225

Scanning computed confocal imager  

DOE Patents (OSTI)

There is provided a confocal imager comprising a light source emitting a light, with a light modulator in optical communication with the light source for varying the spatial and temporal pattern of the light. A beam splitter receives the scanned light and direct the scanned light onto a target and pass light reflected from the target to a video capturing device for receiving the reflected light and transferring a digital image of the reflected light to a computer for creating a virtual aperture and outputting the digital image. In a transmissive mode of operation the invention omits the beam splitter means and captures light passed through the target.

George, John S. (Los Alamos, NM)

2000-03-14T23:59:59.000Z

226

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Laboratory, MST-6 Electron Microscopy Laboratory, MST-6 MST-6 Home Home In the MSL FEI Tecnai F30 Analytical TEM/STEM JEOL 6300FXV High Resolution SEM JEOL 3000F High Resolution Transmission Electron Microscope Philips XL30 F Scanning Electron Microscope & Orientation Imaging System Phillips CM30 Transmission Electron Microscope In the Sigma Building JEOL 840 EPMA with Wavelength Dispersive Spectroscopy FEI Strata DB235 FIB/SEM FEI XL30 Environmental Scanning Electron Microscope & Orientation Imaging System CONTACTS Bob Field 665.3938 Pat Dickerson 665.3036 Rob Dickerson 667.6337 Rod McCabe 606.1649 The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory (EML) is part of MST-6, the Materials Technology - Metallurgy Group within the Materials Science and Technology Division at Los Alamos National Laboratory. It is a facility dedicated to the characterization of materials primarily through imaging, chemical, and crystallographic analyses of material microstructures with several electron and ion beam instruments. Accessory characterization techniques and equipment include energy dispersive x-ray analysis (EDS), wavelength dispersive x-ray analysis (WDS), electron backscatter diffraction (EBSD) and orientation imaging microscopy (OIM), and electron energy loss spectroscopy (EELS).

227

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

An Office of Science User Facility An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

228

Electron Microscopy Lab  

NLE Websites -- All DOE Office Websites (Extended Search)

Facilities » Facilities » Electron Microscopy Lab Electron Microscopy Lab Focusing on the study of microstructures with electron and ion beam instruments, including crystallographic and chemical techniques. April 12, 2012 Transmission electron microscope Rob Dickerson examines a multiphase oxide scale using the FEI Titan 80-300 transmission electron microscope. Contact Rob Dickerson (505) 667-6337 Email Rod McCabe (505) 606-1649 Email Pat Dickerson (505) 665-3036 Email Tom Wynn (505) 665-6861 Email Dedicated to the characterization of materials through imaging, chemical, and crystallographic analyses of material microstructures in support of Basic Energy Science, Laboratory Directed Research and Development, DoD, DOE, Work for Others, nuclear energy, and weapons programs. Go to full website »

229

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Training Training EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers User Training Prior Training in Electron Microscopy: People who wish to operate TEMs must have at least one college-level course in TEM with a lab component or previous TEM experience. The college course can't be one in which TEM was just one of many topics. For researchers who lack academic training and/or practical experience in electron microscopy, we suggest the short courses in TEM at the Hooke College of Applied Sciences, and the hands-on TEM courses at Northwestern University or the University of Chicago or Northern Illinois University.

230

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Overview Overview The mission of the Electron Microscopy Center (EMC) is to: Conduct materials research using advanced microstructural characterization methods; Maintain unique resources and facilities for scientific research for the both the Argonne National Laboratory and national scientific community. Develop and expand the frontiers of microanalysis by fostering the evolution of synergistic state-of-the-art resources in instrumentation, techniques and scientific expertise; The staff members of the EMC carry out their own research as well as participate in collaborative programs with other scientists at Argonne National Laboratory as well as researchers, educators and students worldwide. The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff perform collaborative research with members of other Divisions at Argonne National Laboratory and with collaborators from universities and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

231

Only critical information was scanned  

Office of Legacy Management (LM)

Only critical information was scanned. Entire document is available upon request - Click here to email a...

232

Functional photoacoustic microscopy  

E-Print Network (OSTI)

-fiber phantom??????????????? 20 11 In vivo PAM imaging of subcutaneous microvasculature in rats after SAFT correction????????????????? 21 12 In vivo PAM imaging of subcutaneous microvasculature in rats based on auto-fit scan????????????????? 22... to demonstrate the depth-independent resolution before (A) and after (B) SAFT correction. The comparison of the MIP images before and after the SAFT correction is given by (C) and (D). In order to have a correct representation of the volumetric...

Zhang, Hao

2009-06-02T23:59:59.000Z

233

Argonne CNM: X-Ray Microscopy Capabilities  

NLE Websites -- All DOE Office Websites (Extended Search)

X-Ray Microscopy Facilities X-Ray Microscopy Facilities The Hard X-Ray Nanoprobe (HXN) facility provides scanning fluorescence, scanning diffraction, and full-field transmission and tomographic imaging capabilities with a spatial resolution of 30 nm over a spectral range of 6-12 keV. Modes of Operation Full-Field Transmission Imaging and Nanotomography X-ray transmission imaging uses both the absorption and phase shift of the X-ray beam by the sample as contrast mechanisms. Absorption contrast is used to map the sample density. Elemental constituents can be located by using differential edge contrast in this mode. Phase contrast can be highly sensitive to edges and interfaces even when the X-ray absorption is weak. These contrast mechanisms are exploited to image samples rapidly in full-field transmission mode under various environmental conditions, or combined with nanotomography methods to study the three-dimensional structure of complex and amorphous nanomaterials with the HXN.

234

PHaSE | U.S. DOE Office of Science (SC)  

Office of Science (SC) Website

scanning probe microscopy, near-field scanning optical microscopy, surface science, neutron diffraction and scattering, density functional theory (DFT), monte carlo (MC),...

235

MagLab Audio Dictionary: Probe  

NLE Websites -- All DOE Office Websites (Extended Search)

Probe? Now Playing: What's a Probe? Enable Javascript and Flash to stream the Magnet Minute Greg Boebinger Associated Links Meet the Probes What's a Probe? Probe Development for...

236

Scanning micro-sclerometer  

DOE Patents (OSTI)

A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch.

Oliver, Warren C. (Knoxville, TN); Blau, Peter J. (Oak Ridge, TN)

1994-01-01T23:59:59.000Z

237

Scanning micro-sclerometer  

DOE Patents (OSTI)

A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch. 2 figs.

Oliver, W.C.; Blau, P.J.

1994-11-01T23:59:59.000Z

238

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

iTEAM iTEAM The in situ Transmission Electron Aberration Corrected Microscope (iTEAM) is a proposed project to develop a microscope with powerful capabilities for in situ studies of materials in their native environment. iTEAM will build on the success of the TEAM project by utilizing both spherical and chromatic aberration correction in an electron microscope to provide unprecedented capabilities to study materials in controlled environments of temperature, pressure, or fluidic states with the high-resolution in imaging, diffraction, and spectroscopy typical of electron probes. The capabilities of iTEAM will lead to new ways to understand the behavior of materials in native environments, with particular relevance to major energy initiatives such as catalysis, solar conversion, fuel cells, and batteries. In addition, iTEAM will provide new capabilities to understand organic/inorganic interfaces, functionalized nanoparticles, and biomaterials under natural conditions.

239

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

CM30T TEM CM30T TEM Instrument capabilities: Instrument specifications: Accelerating voltages: 100-300 kV LaB6 emitter Resolution (at 300 kV): ~ 0.25 nm point; ~ 0.14 nm line Minimum probe size: ~ 9 nm Operating modes: CTEM, CBED, SAED, light element XEDS CCD camera: 1 Mp, 14 bits, AVI capture possible at 15 fps Specimen holders: Double Tilt (+/- 60 degrees alpha, +/- 30 degrees beta): with Be cup for XEDS liquid nitrogen cooled (96 K) with Be cup heating (1270 K) Tilt/rotate (+/- 60 degrees alpha, rotation 360 degrees) Single Tilt (+/- 60 degrees alpha) Typical experiments (examples): Quantitative XEDS Morphological and diffraction contrast studies of defects In situ heating & cooling studies Electron crystallography Weak beam studies of defects This page can be downloaded here as an Adobe PDF file.

240

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

FEI Tecnai F20ST TEM/STEM FEI Tecnai F20ST TEM/STEM Instrument capabilities: Instrument specifications: Accelerating voltages: 80-200 kV Schottky FEG emitter Resolution (at 200 kV): ~0.24 nm point; ~0.1 nm line; probe size ~0.2-1 nm Operating modes: CTEM, STEM (BF/ADF, HAADF), CBED, SAED, light element XEDS, EELS, spectrum imaging, energy-filtered imaging (EFI), Lorentz magnetic imaging (LMI), electron holographic imaging (EHI), other computationally-mediated modes. On-axis CCD camera: 16 Mp, 16 bits, 61x61 mm chip size. EMC-owned specimen holders: Double Tilt (+/- 40 degrees alpha, +/- 30 degrees beta): with Be cup for XEDS liquid nitrogen cooled (96 K) with Be cup heating (1270 K) In-plane magnetic field (tilt +/- 40 degrees alpha) Liquid He cooled (tilt +/- 40 degrees alpha, rotate 360 degrees)

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


241

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Submit an EMC Proposal Submit an EMC Proposal EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Submit an EMC Proposal EMC Proposal Submission Deadline Dates for FY2014: November 1, 2013 March 7, 2014 July 11, 2014 Is your proposal a multi-facility proposal? In other words, do you intend to submit proposals to EMC and APS or CNM for your research project? If your answer is "yes," go now to the Proposal Gateway.

242

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

EMC Users Committee EMC Users Committee EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers EMC Users Committee An EMC Users Committee has been organized to enhance communication between the user community and the EMC. While the EMC relies on and encourages strong interaction among its users and between its staff and users, the Users Committee provides an additional formal mechanism for user input into EMC planning and operations to ensure that users' needs and concerns are addressed.

243

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

End-of-Proposal Report End-of-Proposal Report EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers End-of-Proposal Report In accordance with the User Agreement, please provide the EMC with the following information when your proposal expires (one year after its acceptance date or when the experiments end, whichever is sooner). A research summary/progress report using these two templates:

244

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Becoming a User Becoming a User EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÅMM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Procedure to Become a User at the EMC 1. Summary All users have to fulfill certain requirements before access to the EMC can be granted. The following list provides short descriptions of the requirements. Details can be found on this page and via the relevant links at the left. Register for access to Argonne's scientific user facilities (or update your user registration information).

245

Introduction to Photoelectron Emission Microscopy: Principles...  

NLE Websites -- All DOE Office Websites (Extended Search)

Introduction to Photoelectron Emission Microscopy: Principles and Applications. Introduction to Photoelectron Emission Microscopy: Principles and Applications. Abstract: In the...

246

Development of Micromachined Probes for Bio-Nano Applications  

E-Print Network (OSTI)

nitride and a thin gold coating. The tip profile and radius of curvature is tightly controlled in the probe fabrication to ensure a predictable tip-substrate contact. By scanning a fabricated probe on a single crystal silicon surface in ambient... of the magnetic core on the chip and placement of the top conductors with wire bonding. 1) To fabricate the probe substrate with bottom conductors, a layer of chromium (10 nm thick) and gold (300 nm thick) is deposited onto a nitride coated silicon wafer...

Yapici, Murat K.

2010-01-14T23:59:59.000Z

247

High temperature probe  

DOE Patents (OSTI)

A high temperature probe for sampling, for example, smokestack fumes, and is able to withstand temperatures of 3000.degree. F. The probe is constructed so as to prevent leakage via the seal by placing the seal inside the water jacket whereby the seal is not exposed to high temperature, which destroys the seal. The sample inlet of the probe is also provided with cooling fins about the area of the seal to provide additional cooling to prevent the seal from being destroyed. Also, a heated jacket is provided for maintaining the temperature of the gas being tested as it passes through the probe. The probe includes pressure sensing means for determining the flow velocity of an efficient being sampled. In addition, thermocouples are located in various places on the probe to monitor the temperature of the gas passing there through.

Swan, Raymond A. (Fremont, CA)

1994-01-01T23:59:59.000Z

248

Chapter 11 - Light sheet microscopy  

Science Journals Connector (OSTI)

Abstract This chapter introduces the concept of light sheet microscopy along with practical advice on how to design and build such an instrument. Selective plane illumination microscopy is presented as an alternative to confocal microscopy due to several superior features such as high-speed full-frame acquisition, minimal phototoxicity, and multiview sample rotation. Based on our experience over the last 10 years, we summarize the key concepts in light sheet microscopy, typical implementations, and successful applications. In particular, sample mounting for long time-lapse imaging and the resulting challenges in data processing are discussed in detail.

Michael Weber; Michaela Mickoleit; Jan Huisken

2014-01-01T23:59:59.000Z

249

Probing Mercury's Partnering Preferences  

NLE Websites -- All DOE Office Websites (Extended Search)

Preferences Probing Mercury's Partnering Preferences Merc.gif Why it Matters: Mercury (Hg) is a major global pollutant arising from both natural and anthropogenic sources....

250

Probing metal solidification nondestructively  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing metal solidification nondestructively This is the first time that high-energy protons have been used to nondestructively image a large metal sample during melting and...

251

Probing metal solidification nondestructively  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing metal solidification nondestructively This is the first time that high-energy protons have been used to nondestructively image a large metal sample during melting...

252

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

General Information for EMC Users General Information for EMC Users The Electron Microscopy Center (EMC) is an Office of Science User Facility operated for the U.S. Department of Energy Office of Science by Argonne National Laboratory. It is one of three scientific user facilities for electron beam microcharacterization and one of several National User Facilities located at Argonne National Laboratory. As a scientific user facility, the EMC supports user-accessible instruments (Resources) for high spatial resolution microanalysis, field imaging, nanoscale structural characterization, nanoscale fabrication and manipulation, and unique in situ studies of materials under the influence of ion-beam irradiation. These capabilities are used in a diverse variety of research areas to address grand challenge scientific questions encompassing, for example, energy-related studies, biology, astrophysics, archaeology, superconductivity, nanotechnology, environmental engineering, tribology, and ferroelectricity. The research is performed both by users and by EMC staff. While many users work independently, the most challenging research activities require extensive contributions from EMC staff.

253

Rapid scanning mass spectrometer  

SciTech Connect

Mass spectrometers and residual gas analyzers (RGA) are used in a variety of applications for analysis of volatile and semi-volatile materials. Analysis is performed by detecting fragments of gas molecules, based on their mass to charge ratio, which are generated in the mass spectrometer. When used as a detector for a gas chromatograph, they function as a means to quantitatively identify isolated volatile species which have been separated from other species via the gas chromatograph. Vacuum Technology, Inc., (VTI) produces a magnetic sector mass spectrometer/RGA which is used in many industrial and laboratory environments. In order to increase the utility of this instrument, it is desirable to increase the mass scanning speed, thereby increasing the number of applications for which it is suited. This project performed the following three upgrades on the computer interface. (1) A new electrometer was designed and built to process the signal from the detector. This new electrometer is more sensitive, over 10 times faster, and over 100 times more stable than the electrometer it will replace. (2) The controller EPROM was reprogrammed with new firmware. This firmware acts as an operating system for the interface and is used to shuttle communications between the PC and the AEROVAC mass spectrometer. (3) The voltage regulator which causes the ion selector voltage to ramp to allow ions of selected mass to be sequentially detected was redesigned and prototyped. The redesigned voltage regulator can be ramped up or down more than 100 times faster than the existing regulator. These changes were incorporated into a prototype unit and preliminary performance testing conducted. Results indicated that scanning speed was significantly increased over the unmodified version.

Leckey, J.H. [Lockheed Martin Energy Systems, Inc., Oak Ridge, TN (United States); Boeckmann, M.D. [Vacuum Technology, Inc., Oak Ridge, TN (United States)

1996-11-25T23:59:59.000Z

254

Chemical sensing flow probe  

DOE Patents (OSTI)

A new chemical probe determines the properties of an analyte using the light absorption of the products of a reagent/analyte reaction. The probe places a small reaction volume in contact with a large analyte volume. Analyte diffuses into the reaction volume. Reagent is selectively supplied to the reaction volume. The light absorption of the reaction in the reaction volume indicates properties of the original analyte. The probe is suitable for repeated use in remote or hostile environments. It does not require physical sampling of the analyte or result in significant regent contamination of the analyte reservoir.

Laguna, George R. (Albuquerque, NM); Peter, Frank J. (Albuquerque, NM); Butler, Michael A. (Albuquerque, NM)

1999-01-01T23:59:59.000Z

255

Probing Ion Channel Conformational Dynamics Using Simultaneous Single-Molecule Ultrafast Spectroscopy and Patch-Champ Electric Recording  

SciTech Connect

A new approach to probing single-molecule ion channel kinetics and conformational dynamics, patch-clamp confocal fluorescence microscopy (PCCFM), uses simultaneous ultrafast fluorescence spectroscopy and single-channel electric current recording.

Harms, Gregory S.; Orr, Galya; Lu, H Peter

2004-03-08T23:59:59.000Z

256

The gridded electromagnet probe  

E-Print Network (OSTI)

We attempted to measure the anisotropy in the electron distribution function in magnetized plasma by exploiting the adiabatic invariance of the electron's magnetic moment with a probe comprising a grid, a collector, and ...

Shadman, K. (Khashayar), 1972-

2003-01-01T23:59:59.000Z

257

Analytical electron microscopy characterization of uranium-contaminated soils from the Fernald Site, FY1993 report  

SciTech Connect

A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM) is being used to determine the nature of uranium in soils from the Fernald Environmental Management Project. The information gained from these studies is being used to develop and test remediation technologies. Investigations using SEM have shown that uranium is contained within particles that are typically 1 to 100 {mu}m in diameter. Further analysis with AEM has shown that these uranium-rich regions are made up of discrete uranium-bearing phases. The distribution of these uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Cunnane, J.C.; Brown, N.R.; Dietz, N.L.

1994-10-01T23:59:59.000Z

258

Convective heat flow probe  

DOE Patents (OSTI)

A convective heat flow probe device is provided which measures heat flow and fluid flow magnitude in the formation surrounding a borehole. The probe comprises an elongate housing adapted to be lowered down into the borehole; a plurality of heaters extending along the probe for heating the formation surrounding the borehole; a plurality of temperature sensors arranged around the periphery of the probe for measuring the temperature of the surrounding formation after heating thereof by the heater elements. The temperature sensors and heater elements are mounted in a plurality of separate heater pads which are supported by the housing and which are adapted to be radially expanded into firm engagement with the walls of the borehole. The heat supplied by the heater elements and the temperatures measured by the temperature sensors are monitored and used in providing the desired measurements. The outer peripheral surfaces of the heater pads are configured as segments of a cylinder and form a full cylinder when taken together. A plurality of temperature sensors are located on each pad so as to extend along the length and across the width thereof, with a heating element being located in each pad beneath the temperature sensors. An expansion mechanism driven by a clamping motor provides expansion and retraction of the heater pads and expandable packet-type seals are provided along the probe above and below the heater pads.

Dunn, J.C.; Hardee, H.C.; Striker, R.P.

1984-01-09T23:59:59.000Z

259

Multispectral imaging probe  

DOE Patents (OSTI)

A multispectral imaging probe delivers a range of wavelengths of excitation light to a target and collects a range of expressed light wavelengths. The multispectral imaging probe is adapted for mobile use and use in confined spaces, and is sealed against the effects of hostile environments. The multispectral imaging probe comprises a housing that defines a sealed volume that is substantially sealed from the surrounding environment. A beam splitting device mounts within the sealed volume. Excitation light is directed to the beam splitting device, which directs the excitation light to a target. Expressed light from the target reaches the beam splitting device along a path coaxial with the path traveled by the excitation light from the beam splitting device to the target. The beam splitting device directs expressed light to a collection subsystem for delivery to a detector. 8 figs.

Sandison, D.R.; Platzbecker, M.R.; Descour, M.R.; Armour, D.L.; Craig, M.J.; Richards-Kortum, R.

1999-07-27T23:59:59.000Z

260

Multispectral imaging probe  

DOE Patents (OSTI)

A multispectral imaging probe delivers a range of wavelengths of excitation light to a target and collects a range of expressed light wavelengths. The multispectral imaging probe is adapted for mobile use and use in confined spaces, and is sealed against the effects of hostile environments. The multispectral imaging probe comprises a housing that defines a sealed volume that is substantially sealed from the surrounding environment. A beam splitting device mounts within the sealed volume. Excitation light is directed to the beam splitting device, which directs the excitation light to a target. Expressed light from the target reaches the beam splitting device along a path coaxial with the path traveled by the excitation light from the beam splitting device to the target. The beam splitting device directs expressed light to a collection subsystem for delivery to a detector.

Sandison, David R. (Moriarty, NM); Platzbecker, Mark R. (Albuquerque, NM); Descour, Michael R. (Tucson, AZ); Armour, David L. (Albuquerque, NM); Craig, Marcus J. (Albuquerque, NM); Richards-Kortum, Rebecca (Austin, TX)

1999-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


261

Simulating realistic imaging conditions for in situ liquid microscopy  

SciTech Connect

In situ transmission electron microscopy enables the imaging of biological cells, macromolecular protein complexes, nanoparticles, and other systems in a near-native environment. In order to improve interpretation of image contrast features and also predict ideal imaging conditions ahead of time, new virtual electron microscopic techniques are needed. A technique for virtual fluid-stage high-angle annular dark-field scanning transmission electron microscopy with the multislice method is presented that enables the virtual imaging of model fluid-stage systems composed of millions of atoms. The virtual technique is exemplified by simulating images of PbS nanoparticles under different imaging conditions and the results agree with previous experimental findings. General insight is obtained on the influence of the effects of fluid path length, membrane thickness, nanoparticle position, defocus and other microscope parameters on attainable image quality.

Welch, David A.; Faller, Roland; Evans, James E.; Browning, Nigel D.

2013-12-01T23:59:59.000Z

262

Acoustic microscopy for characterization of high?temperature superconducting tape  

Science Journals Connector (OSTI)

Although material scientists constantly discover superconducting compounds with higher critical temperatures (T c s) manufacturing of the high?temperature superconductors(HTS) remains a problem and long lengths (>1 mile) have yet to be produced. In an effort to produce long length superconductors manufacturing steps for HTS tape production have been critically looked at to find their effects in producing tape with the desired characteristics. In support of determining superconducting tapecharacteristics acoustic microscopy offers the potential for internal microstructural material characterization. This research will ultimately support in?process monitoring of HTSmanufacturing as part of an advanced sensing system to determine the presence of defects and/or the effects of process variables on the HTS tape. This presentation will overview scanning acoustic microscopy and present images of HTS tape at several frequencies ranging from 50 to 500 MHz. The results clearly demonstrate the feasibility of determining the Ag/ceramic interface location and the general integrity of the constituents.

Chiaki Miyasaka; Chris Cobucci; Bernhard Tittmann

1997-01-01T23:59:59.000Z

263

Partial scan design and test sequence generation based on reduced scan shift method  

Science Journals Connector (OSTI)

This paper presents a partial scan algorithm, calledPARES (PartialscanAlgorithm based onREduced Scan shift), for designing partial scan circuits. PARES is based on the reduced scan shift that has been previously ...

Yoshinobu Higami; Seiji Kajihara; Kozo Kinoshita

264

Dynamic Characterization of Graphene Growth and Etching by Oxygen on Ru(0001) by Photoemission Electron Microscopy  

E-Print Network (OSTI)

Dynamic Characterization of Graphene Growth and Etching by Oxygen on Ru(0001) by Photoemission of graphene on Ru(0001) was investigated by photoemission electron microscopy (PEEM) and scanning tunneling, we show that graphene overlayers with sizes ranging from nanometers to sub-millimeters have been

Bao, Xinhe

265

Single Molecule Emission Characteristics in Near-Field Microscopy  

Science Journals Connector (OSTI)

In near-field scanning optical microscopy (NSOM), the measured fluorescence lifetime of a single dye molecule can be shortened or lengthened, sensitively dependent on the relative position between the molecule and aluminum coated fiber tip. The modified lifetimes and other emission characteristics are simulated by solving Maxwell equations with the finite-difference time-domain (FDTD) method. The 2D computation reveals insight into the lifetime behaviors and provides guidance for nonperturbative spectroscopic measurements with NSOM. This new methodology is capable of predicting molecular emission properties in front of a metal/dielectric interface of arbitrary geometry.

Randy X. Bian; Robert C. Dunn; X. Sunney Xie; P. T. Leung

1995-12-25T23:59:59.000Z

266

Characterisation of Hadley grains by confocal microscopy  

Science Journals Connector (OSTI)

This work forms part of an exploratory study to investigate the use of fluorescent laser scanning confocal microscopy (LSCM) for imaging pores and voids in hardened mortar and concrete. The study has revealed the suitability of the technique for the characterisation of hollow shell (Hadley) hydration grains (these are grains that contain a void within the original boundary of the cement grain). It was found that Hadley grains could be imaged using fluorescent light techniques, subsequent to their impregnation by epoxy resin doped with a fluorescent dye. Prior to this work, it was not clear whether hollow grains were impregnated due to connections with capillary pores, or if they had been impregnated due to connections with damage caused during surface preparation (i.e. micro-cracks or deep surface scratches). However using the 3D LSCM imaging technique it was observed that connections between Hadley grains and hardened cement paste (HCP) capillary pores did exist, in different forms, at depths well below the surface providing conduits along which resin was able to flow and impregnate the hollow grains. Other aspects of imaging Hadley grains are also described, such as the sectioning of tips of larger grains often taken as separate smaller pores or grains in 2D images.

M.K. Head; H.S. Wong; N.R. Buenfeld

2006-01-01T23:59:59.000Z

267

Attempt of correlative observation of morphological synaptic connectivity by combining confocal laser-scanning microscope and FIB-SEM for immunohistochemical staining technique  

Science Journals Connector (OSTI)

......University, Uchinada, Japan 2 Department of Morphological Brain Science, Graduate School of Medicine, Kyoto University, Kyoto...B. Serial sec- tion scanning electron microscopy of adult brain tissue using focused ion beam milling. J. Neurosci (2008......

Takahiro Sonomura; Takahiro Furuta; Ikuko Nakatani; Yo Yamamoto; Satoru Honma; Takeshi Kaneko

2014-11-01T23:59:59.000Z

268

Role of bias voltage and tunneling current in the perpendicular displacements of freestanding graphene via scanning  

E-Print Network (OSTI)

graphene via scanning tunneling microscopy Peng Xu, Steven D. Barber, Matthew L. Ackerman, James Kevin measurements of freestanding graphene as a function of applied bias voltage and tunneling current setpoint, the graphene approaches the STM tip, while, on the other hand, when the tunneling current is increased

Thibado, Paul M.

269

Design of a scanning Josephson junction microscope for submicron-resolution magnetic imaging  

SciTech Connect

We describe a magnetic field scanning instrument designed to extend the spatial resolution of scanning superconducting quantum interference device microscopy into the submicron regime. This instrument, the scanning Josephson junction microscope, scans a single Josephson junction across the surface of a sample, detecting the local magnetic field by the modulation of the junction critical current. By using a submicron junction and a scanning tunneling microscope feedback system to maintain close proximity to the surface, magnetic field sensitivity of 10 {mu}G with a spatial resolution of 0.3 {mu}m should be attainable, opening up new opportunities for imaging vortex configurations and core structure in superconductors and magnetic domains in magnetic materials. {copyright} {ital 1999 American Institute of Physics.}

Plourde, B.L.; Van Harlingen, D.J. [Department of Physics, Science and Technology Center for Superconductivity, and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)] [Department of Physics, Science and Technology Center for Superconductivity, and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)

1999-11-01T23:59:59.000Z

270

Synchronized monochromator and insertion device energy scans at SLS  

SciTech Connect

Synchronous monochromator and insertion device energy scans were implemented at the Surfaces/Interfaces:Microscopy (SIM) beamline in order to provide the users fast X-ray magnetic dichroism studies (XMCD). A simple software control scheme is proposed based on a fast monochromator run-time energy readback which quickly updates the insertion device requested energy during an on-the-fly X-ray absorption scan (XAS). In this scheme the Plain Grating Monochromator (PGM) motion control, being much slower compared with the insertion device (APPLE-II type undulator), acts as a 'master' controlling the undulator 'slave' energy position. This master-slave software implementation exploits EPICS distributed device control over computer network and allows for a quasi-synchronous motion control combined with data acquisition needed for the XAS or XMCD experiment.

Krempasky, J.; Flechsig, U.; Korhonen, T.; Zimoch, D.; Quitmann, Ch.; Nolting, F. [Paul Scherrer Institut, Villigen, Swiss Light Source, 5235 Villigen PSI (Switzerland)

2010-06-23T23:59:59.000Z

271

Characterization and Theory of Electrocatalysts Based on Scanning Electrochemical Microscopy Screening Methods  

E-Print Network (OSTI)

with results for Pd-Co catalysts. This is based on establishing guidelines for selecting test systems, rapid cell cathode where the oxygen reduction reaction (ORR) occurs and important questions about whether the currently favored electrocatalyst for polymer electrolyte membrane fuel cells (PEMFC), Pt supported on C

Henkelman, Graeme

272

Imaging an ionic liquid adlayer by scanning tunneling microscopy at the solid|vacuum interface  

E-Print Network (OSTI)

of Surface Chemistry and Catalysis, Ulm University, D-89069 Ulm, Germany 2 Institute of Particle Technology, Clausthal University of Technology, D-38678 Clausthal- Zellerfeld, Gemany Abstract The first imaging(pentafluoroethyl)trifluorophosphate ([Py1,4]FAP) was evaporated onto a clean Au(111) surface by a Knudsen-type evaporator and the surface

Pfeifer, Holger

273

Recent Advances in Atomic-Scale Spin-Polarized Scanning Tunneling Microscopy  

E-Print Network (OSTI)

, Faradayweg 4-6 D-14195 Berlin (Dahlem) Germany WALTER R. L. LAMBRECHT Department of Physics, Case Western of atomically clean magnetic surfaces. Several key findings have been obtained. First, both magnetic and non Nanometer scale science and technology has been an area of intense research and development activity within

274

Electrochemical Scanning Tunneling Microscopy:? Adlayer Structure and Reaction at Solid/liquid Interface  

Science Journals Connector (OSTI)

From 2003?2006, he was a postdoctoral fellow and visiting fellow in the Department of Chemistry, Unversity of Alberta and National Institute for Nanotechnology (NINT), National Research Council (NRC), Canada. ... On the other hand, ex situ UHV surface characterization techniques, such as low-energy electron diffraction (LEED), electron energy-loss spectroscopy, and Auger electron spectroscopy have also supplied important information on the structure of the specific adsorption. ... Building up complicated assemblies is one big challenge for the future of bottom-up nanodevice fabrication. ...

Dong Wang; Li-Jun Wan

2007-10-09T23:59:59.000Z

275

Improvement of lateral resolution of scanning photo-induced impedance microscopy (SPIM)  

E-Print Network (OSTI)

in the gate metal into an area not covered by metal Influence of semiconductor donor concentration Ga Control Lock-In-Amp. Z X Y CD-ROM player optics Computer Control Output 1000 2000 3000 4000 1000 2000 3000

Moritz, Werner

276

SCANNING ELECTRON MICROSCOPY AND PORE CASTING: CHEROKEE AND BUG FIELDS, SAN JUAN COUNTY, UTAH  

SciTech Connect

Over 400 million barrels (64 million m{sup 3}) of oil have been produced from the shallow-shelf carbonate reservoirs in the Pennsylvanian (Desmoinesian) Paradox Formation in the Paradox Basin, Utah and Colorado. With the exception of the giant Greater Aneth field, the other 100 plus oil fields in the basin typically contain 2 to 10 million barrels (0.3-1.6 million m{sup 3}) of original oil in place. Most of these fields are characterized by high initial production rates followed by a very short productive life (primary), and hence premature abandonment. Only 15 to 25 percent of the original oil in place is recoverable during primary production from conventional vertical wells. An extensive and successful horizontal drilling program has been conducted in the giant Greater Aneth field. However, to date, only two horizontal wells have been drilled in small Ismay and Desert Creek fields. The results from these wells were disappointing due to poor understanding of the carbonate facies and diagenetic fabrics that create reservoir heterogeneity. These small fields, and similar fields in the basin, are at high risk of premature abandonment. At least 200 million barrels (31.8 million m{sup 3}) of oil will be left behind in these small fields because current development practices leave compartments of the heterogeneous reservoirs undrained. Through proper geological evaluation of the reservoirs, production may be increased by 20 to 50 percent through the drilling of low-cost single or multilateral horizontal legs from existing vertical development wells. In addition, horizontal drilling from existing wells minimizes surface disturbances and costs for field development, particularly in the environmentally sensitive areas of southeastern Utah and southwestern Colorado.

Thomas C. Chidsey Jr; David E. Eby; Louis H. Taylor

2003-12-01T23:59:59.000Z

277

Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems  

Science Journals Connector (OSTI)

...in solving the pressing energy problems facing us today...Discussion Meeting Issue New possibilities with aberration-corrected...Wang), pp.152-191. New York, NY: Springer. Pennycook...and analysis to solving energy problems. | The new possibilities of aberration-corrected...

2009-01-01T23:59:59.000Z

278

A technique for quantitative and qualitative viewing of aquatic bacteria using scanning electron microscopy  

E-Print Network (OSTI)

microscopic enumeration techniques. Water samples are concentrated on pre-wetted (Triton X-100) Nuclepore filters (0. 2 um pore size) to prov1de a uniform distri- bution of bacteria on the filter surface and vacuum filtered (660 Torr). The filter... is transferred to a petri dish containing filter paper soaked 1n 2% glutaraldehyde and the bacter1a are fixed for one hour. Dehydration 1s performed by transferr1ng the filters through a series of petri dishes conta1ning filter paper saturated with 25, 50, 75...

Dreier, Thomas Michael

2012-06-07T23:59:59.000Z

279

Scanning Tunneling Microscopy Studies of Metal Clusters Supported on Graphene and Silica Thin Film  

E-Print Network (OSTI)

The understanding of nucleation and growth of metals on a planar support at the atomic level is critical for both surface science research and heterogeneous catalysis studies. In this dissertation, two planar substrates, including graphene and ultra...

Zhou, Zihao

2012-10-19T23:59:59.000Z

280

Transparent Metal Films for Detection of Single-Molecule Optical Absorption by Scanning Tunneling Microscopy  

Science Journals Connector (OSTI)

To ensure better contact between the sample holder and the thin films, thick silver contacts are deposited at the sample edge using colloidal silver paint (Ted Pella Inc.). ... Berciaud, S.; Cognet, L.; Poulin, P.; Weisman, R. B.; Lounis, B.Absorption Spectroscopy of Individual Single-Walled Carbon Nanotubes Nano Lett. ...

Lea Nienhaus; Gregory E. Scott; Richard T. Haasch; Sarah Wieghold; Joseph W. Lyding; Martin Gruebele

2014-05-22T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


281

Scanning near-field optical microscopy based on the heterodyne phase-controlled oscillator method  

E-Print Network (OSTI)

obtained for the case of larger vibration amplitudes of the tip. © 2000 American Institute of Physics. S, the particular mechanical properties of such a ``lever'' prevented the broad use of the force-measurement. The idea behind the method is based on the measurement of the damping of the oscillation of the tip subject

Texas at Austin. University of

282

Scanning Tunneling Microscopy Study of Molybdenum Disulfide and its Derivatives on Cu(111)  

E-Print Network (OSTI)

during STM measurement to avoid vibrations and all thethe vibrations from the ground during STM measurement. For

Lu, Wenhao

2014-01-01T23:59:59.000Z

283

Recent advances in electron imaging, image interpretation and applications: environmental scanning electron microscopy  

Science Journals Connector (OSTI)

...specimens in a more `natural' state. As early...the presence of a gas in the specimen chamber...Ionizing collisions with gas molecules generate...SEs, causing a `cascade' of electrons...turn influencing gas cascade amplification. Add...

2003-01-01T23:59:59.000Z

284

Morphological expressions of antibiotic synergism against Pseudomonas aeruginosa as observed by scanning electron microscopy.  

Science Journals Connector (OSTI)

...spheroplasts; (v) surface holes or pits; (vi) super-elongation...spheroplasts; (v) surface holes or pits; (vi) super-elongation...spheroplasts; (v) surface holes or pits; (vi) super-elongation...isolated from a patient with severe burns. The susceptibility of the...

S J Waisbren; D J Hurley; B A Waisbren

1980-12-01T23:59:59.000Z

285

Imaging Single ZnO Vertical Nanowire Laser Cavities using UV-Laser Scanning Confocal Microscopy  

E-Print Network (OSTI)

emerging in the field of optoelectronics and nanophotonicsemerging in the field of optoelectronics and nanophotonics.

Yang, P.

2009-01-01T23:59:59.000Z

286

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

related to the total atomic absorption cross section, ? A (number. Tabulations of atomic absorption cross sections areC are the mass absorption coefficients and atomic masses for

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

287

Etched chalcogenide fibers for near-field infrared scanning microscopy M. A. Unger,a)  

E-Print Network (OSTI)

Electron Laser Center, Stanford, California 94305-4085 Received 12 December 1997; accepted for publication by a sulfur-selenide cladding, which is in turn coated with a polymer such as polyamide. For use in a near cladding surrounding the core, and etching the chalcogenide fiber core to a sharp point. Removal

Palanker, Daniel

288

Scanning Electron Microscopy of Squid, Loligo peale;: Raw, Cooked, and Frozen Mantle  

E-Print Network (OSTI)

OTWELL and GEORGE G. GIDDINGS W. Steven Otwell is with the Department of Food Science and Human Nutrition, University of Florida, Gainesville, FL 32611. George G. Gid- dings is with the Fundacion Chile, Avda Santa, but cooking caused gross distortions in all mantle tissues. North Carolina, and cleaned for use (skin, head

289

Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems  

Science Journals Connector (OSTI)

...fuels, but the conversion efficiency of...into electrical energy is limited by...functionality in energy conversion devices such as...insights into the carrier dynamics in the...ability to study energy conversion processes in materials...

2009-01-01T23:59:59.000Z

290

Evaluation of drilled circuit boards using scanning white light interference microscopy  

E-Print Network (OSTI)

of panels drilled at one time. ~ Head Height (HD) - Height of the drill head in inches over the panel. Head height is indicative of the non-drilling, cool-off time out of the hole. A higher head height takes longer time between holes. . Table 4 shows... 7 Avera e Ra, R, and Rt values Bit Block HT SP CL HD PN R& R, R4 1 3 -1 1 -1 -1 1 45. 0395 3. 33275 2. 2925 -1 -1 1 1 -1 609535 5. 28325 3. 752 10 12 -1 1 -1 1 -1 37. 034 3. 5655 2. 7505 4. 14425 4. 3065 5. 827 1 1 1 60. 2075 1 1 1 -1 1 -1...

Nissen, Kristine Kay

2012-06-07T23:59:59.000Z

291

Scanning tunneling microscopy investigation of the TiO2 anatase ,,101... surface Wilhelm Hebenstreit,1  

E-Print Network (OSTI)

of tunneling sites in STM. Titanium dioxide (TiO2) is a versatile material that finds uses as a promoter. Fourfold-coordinated Ti atoms at step edges are preferred adsorption sites and allow the identification

Diebold, Ulrike

292

Study of perineal patterns of four species of Meloidogyne (Nematoda:Heteroderoidea) using scanning electron microscopy  

E-Print Network (OSTI)

Strawberry ~tco ersico culent m Arachis ~ho ea Citrull ~ s )rraris ~tco e sico escule t ~ca sicum fr tescens Arachis ~ho ea ~fa a ia sp. Rutgers Florunner Charleston Gray Rutgers California Wonder Florunner Albritton M. ~ico ~ ta M. java' ice... 75-8 (Race 1) 75-30 (Race 3) 75-30 75-37 73-57 74-19 75-37 75-32 75-2 Tomato Tomato Sweet potato Watermelon Corn Pepper Cotton Tomato Watermelon ~tco ersicon esc lentum ~to ersico esculentum ~iomoea batatas C t ullus ~ul s Zea...

Khan, Zainab Najafali

2012-06-07T23:59:59.000Z

293

Optimizing the environment for sub-0.2 nm scanning transmission electron microscopy  

Science Journals Connector (OSTI)

......where the manufacturer's specifications will be most complete) are...or neoprene greatly damps thermal fluctuations (Fig. 7...with neoprene for improved thermal stability. D. A. Muller...column helps greatly, better insulation of the stage drives and objective......

A Muller; J Grazul

2001-05-01T23:59:59.000Z

294

New views of materials through aberration-corrected scanning transmission electron microscopy  

Science Journals Connector (OSTI)

......analysis to solving energy problems. Phil...eds. (2007) New York: Springer...and electron energy loss spectroscopy...eds. (2011) New York: Springer...for electron energy loss spectroscopy...can now give new insights into......

S. J. Pennycook; M. Varela

2011-08-01T23:59:59.000Z

295

Toward Automated Analysis of Biofilm Architecture: Bias Caused by Extraneous Confocal Laser Scanning Microscopy Images  

Science Journals Connector (OSTI)

...bulk-medium interface boundaries...Zeisss CLSM interface software...spreading, two-dimensional fractal dimension...average and standard deviation...34). Measuring the thickness...of various interface PACVEIRs on the standard deviation...

Robin T. Merod; Jennifer E. Warren; Hope McCaslin; Stefan Wuertz

2007-06-01T23:59:59.000Z

296

Investigation of furan on vicinal Pd(1 1 1) by scanning tunneling microscopy  

E-Print Network (OSTI)

fraction in liquids derived from coal and biomass, with methylated phe- nols and furanic rings constituting, including coal and biomass [1]. Oxygen-containing aromatic heterocompounds form the largest contaminant

Chiang, Shirley

297

Scanning Tunneling Microscopy Study of Molybdenum Disulfide and its Derivatives on Cu(111)  

E-Print Network (OSTI)

principles electronic structure calculations . 27 3.1principles electronic structure calculations The followingFirst-principles electronic structure calculations, Physical

Lu, Wenhao

2014-01-01T23:59:59.000Z

298

Automated detection and time lapse analysis of dendritic spines in laser scanning microscopy images  

E-Print Network (OSTI)

is roughly divided into three related components. First, we focus on an image processing pipeline we have and Repair (now Harvard Neurodiscovery Center). I also would like to thank our collaborators: Bernardo

Miller, Eric

299

Scanning Tunneling Microscopy Study of Molybdenum Disulfide and its Derivatives on Cu(111)  

E-Print Network (OSTI)

in ultra-high vacuum(UHV) conditions are systematicallybuilt ultra high vacuum (UHV) STMs in Bartels group withbuilt ultra high vacuum (UHV) STMs in Bartels group with

Lu, Wenhao

2014-01-01T23:59:59.000Z

300

Internal Image Potential in Semiconductors - Effect on Scanning-Tunneling-Microscopy  

E-Print Network (OSTI)

10 10 m ~ o 0 ~ 410 g (25) j(s)=, f dE,D(E?s ) [No(E, ) No(E, qV)?], ? @ mp where mo is the free-electron mass, No(E, ) and No(E, ?qV) are one-dimensional finite-temperature sup- ply functions for electrons in the semiconductor and metal... correct only for a square barrier. If we define the cumulative current density as a function of energy according to Ej (E?s) =e J dE,'D(E,', s )[Xo(E,') Ko(E,' q?V)], ?0 (27) 0.2- ?0.2 ?0.6 5x10 cm (s=5k) the diff'erential current density per...

HUANG, ZH; WEIMER, M.; Allen, Roland E.

1993-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


301

Dynamic imaging with electron microscopy  

ScienceCinema (OSTI)

Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

2014-05-30T23:59:59.000Z

302

Dynamic imaging with electron microscopy  

SciTech Connect

Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

2014-02-20T23:59:59.000Z

303

Scan  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

NAME OF PERSON WITH WHOM TO CONFER TELEPHONE DATE ARCHIVIST OF THE UNITED STATES Sharon Evelin NUMBER 1 301 -903-3455 i 1 - I REQUEST FOR REe?RDS DISPOSITION AUTHORITY NUMBER /dl- Y s + - o + - / TO: NATIONAL ARCH~VES & RECORDS ADMINISTRATION 8601 ADELPHI ROAD COLLEGE PARK, MD 20740-6001 1. FROM (Agency or establ~shment) U.S. DEPARTMENT OF ENERGY MAJOR SUBDIVISION Office of the Chief Information Officer MINOR SUBDIVISION Records Management Division I 1 8. DESCRIPTION OF ITEM AND PROPOSED DISPOSITION 1 9. GRS OR 1 10. A ~ T I O r Date received I Z L U V - ~ NOTIFICATION TO AGENCY In accordance with the provlslons of 44 U.S.C 3303a, the dlsposltlon request, Including amendments, 1 s approved except for Items that may be marked "dlsposltion not approved" or "withdrawn" In column 10.

304

Center for Emergent Superconductivity (CES) | U.S. DOE Office...  

Office of Science (SC) Website

Methods X-ray diffraction and scattering, electron microscopy, scanning probe microscopy, neutron diffraction and scattering, density functional theory (DFT), monte carlo (MC),...

305

Dark Energy Probes of Dark Energy  

E-Print Network (OSTI)

19/12/2013 1 Dark Energy Probes of Dark Energy Probes Dark Energy Supernovae Ia probing luminosity (Betti numbers) #12;19/12/2013 2 Dark Energy Probes: Comparison Method Strengths Weaknesses Systematics

Weijgaert, Rien van de

306

Optimizing and extending light-sculpting microscopy for fast functional imaging in neuroscience  

E-Print Network (OSTI)

A number of questions in systems biology such as understanding how dynamics of neuronal networks are related to brain function require the ability to capture the functional dynamics of large cellular populations at high speed. Recently, this has driven the development of a number of parallel and high speed imaging techniques such as light-sculpting microscopy, which has been used to capture neuronal dynamics at the whole brain and single cell level in small model organism. However, the broader applicability of light-sculpting microscopy is limited by the size of volumes for which high speed imaging can be obtained and scattering in brain tissue. Here, we present strategies for optimizing the present tradeoffs in light-sculpting microscopy. Various scanning modalities in light-sculpting microscopy are theoretically and experimentally evaluated, and strategies to maximize the obtainable volume speeds, and depth penetration in brain tissue using different laser systems are provided. Design-choices, important par...

Rupprecht, Peter; Groessl, Florian; Haubensak, Wulf E; Vaziri, Alipasha

2015-01-01T23:59:59.000Z

307

Note: Design and development of an integrated three-dimensional scanner for atomic force microscopy  

SciTech Connect

A compact scanning head for the Atomic Force Microscope (AFM) greatly enhances the portability of AFM and facilitates easy integration with other tools. This paper reports the design and development of a three-dimensional (3D) scanner integrated into an AFM micro-probe. The scanner is realized by means of a novel design for the AFM probe along with a magnetic actuation system. The integrated scanner, the actuation system, and their associated mechanical mounts are fabricated and evaluated. The experimentally calibrated actuation ranges are shown to be over 1 ?m along all the three axes.

Rashmi, T.; Dharsana, G.; Sriramshankar, R.; Sri Muthu Mrinalini, R.; Jayanth, G. R. [Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore 560012 (India)] [Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore 560012 (India)

2013-11-15T23:59:59.000Z

308

Electromagnetic Probes in PHENIX  

E-Print Network (OSTI)

Electromagnetic probes are arguably the most universal tools to study the different physics processes in high energy hadron and heavy ion collisions. In this paper we summarize recent measurements of real and virtual direct photons at central rapidity by the PHENIX experiment at RHIC in p+p, d+Au and Au+Au collisions. We also discuss the impact of the results and the constraints they put on theoretical models. At the end we report on the immediate as well as on the mid-term future of photon measurements at RHIC.

Gabor David

2006-09-21T23:59:59.000Z

309

ARM: W-Band Scanning ARM Cloud Radar (W-SACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)  

DOE Data Explorer (OSTI)

W-Band Scanning ARM Cloud Radar (W-SACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

Widener, Kevin; Nelson, Dan; Bharadwaj, Nitin; Lindenmaier, Iosif [Andrei; Johnson, Karen

310

ARM: Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)  

DOE Data Explorer (OSTI)

Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

Bharadwaj, Nitin; Widener, Kevin

311

ARM: X-Band Scanning ARM Cloud Radar (XSACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)  

DOE Data Explorer (OSTI)

X-Band Scanning ARM Cloud Radar (XSACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

Widener, Kevin; Nelson, Dan; Bharadwaj, Nitin; Lindenmaier, Iosif [Andrei; Johnson, Karen

312

Hyperspectral Microscopy of Explosives Particles Using an External Cavity Quantum Cascade Laser  

SciTech Connect

Using infrared hyperspectral imaging, we demonstrate microscopy of small particles of the explosives compounds RDX, tetryl, and PETN with near diffraction-limited performance. The custom microscope apparatus includes an external cavity quantum cascade laser illuminator scanned over its tuning range of 9.13-10.53 m in four seconds, coupled with a microbolometer focal plane array to record infrared transmission images. We use the hyperspectral microscopy technique to study the infrared absorption spectra of individual explosives particles, and demonstrate sub-nanogram detection limits.

Phillips, Mark C.; Bernacki, Bruce E.

2012-12-26T23:59:59.000Z

313

Variable path length spectrophotometric probe  

DOE Patents (OSTI)

A compact, variable pathlength, fiber optic probe for spectrophotometric measurements of fluids in situ. The probe comprises a probe body with a shaft having a polished end penetrating one side of the probe, a pair of optic fibers, parallel and coterminous, entering the probe opposite the reflecting shaft, and a collimating lens to direct light from one of the fibers to the reflecting surface of the shaft and to direct the reflected light to the second optic fiber. The probe body has an inlet and an outlet port to allow the liquid to enter the probe body and pass between the lens and the reflecting surface of the shaft. A linear stepper motor is connected to the shaft to cause the shaft to advance toward or away from the lens in increments so that absorption measurements can be made at each of the incremental steps. The shaft is sealed to the probe body by a bellows seal to allow freedom of movement of the shaft and yet avoid leakage from the interior of the probe.

O'Rourke, Patrick E. (157 Greenwood Dr., Martiney, GA 30907); McCarty, Jerry E. (104 Recreation Dr., Aiken, SC 29803); Haggard, Ricky A. (1144 Thornwood Drive, North Augusta, SC 29891)

1992-01-01T23:59:59.000Z

314

NASA DC-8 Airborne Scanning Lidar System  

Science Journals Connector (OSTI)

A scanning lidar system is being developed for installation on the NASA DC-8 atmospheric research aircraft to support...in-situ aerosol and gas measurements. Design and objectives of the DC-8 scanning lidar are p...

Norman B. Nielsen; Edward E. Uthe

1997-01-01T23:59:59.000Z

315

Three-dimensional scanning confocal laser microscope  

DOE Patents (OSTI)

A confocal microscope for generating an image of a sample includes a first scanning element for scanning a light beam along a first axis, and a second scanning element for scanning the light beam at a predetermined amplitude along a second axis perpendicular to the first axis. A third scanning element scans the light beam at a predetermined amplitude along a third axis perpendicular to an imaging plane defined by the first and second axes. The second and third scanning element are synchronized to scan at the same frequency. The second and third predetermined amplitudes are percentages of their maximum amplitudes. A selector determines the second and third predetermined amplitudes such that the sum of the percentages is equal to one-hundred percent.

Anderson, R. Rox (Lexington, MA); Webb, Robert H. (Lincoln, MA); Rajadhyaksha, Milind (Charlestown, MA)

1999-01-01T23:59:59.000Z

316

Scan Energy AS | Open Energy Information  

Open Energy Info (EERE)

Scan Energy AS Jump to: navigation, search Name: Scan Energy AS Place: Dybvad, Denmark Zip: DK-9352 Sector: Solar, Wind energy Product: Denmark-based solar and wind power project...

317

The X-ray microscopy beamline UE46-PGM2 at BESSY  

SciTech Connect

The Max Planck Institute for Metal Physics in Stuttgart and the Helmholtz Center Berlin operate a soft X-ray microscopy beamline at the storage ring BESSY II. A collimated PGM serves as monochromator for a scanning X-ray microscope and a full field X-ray microscope at the helical undulator UE46. The selection between both instruments is accomplished via two switchable focusing mirrors. The scanning microscope (SM) is based on the ALS STXM microscope and fabricated by the ACCEL company. The full field microscope (FFM) is currently in operation at the U41-SGM beamline and will be relocated to its final location this year.

Follath, R.; Schmidt, J. S. [Helmholtz-Center Berlin, Albert-Einstein-Strasse 15, 12489 Berlin (Germany); Weigand, M. [Max Planck Institute for Metals Research, Heisenbergstrasse 3, 70569 Stuttgart (Germany); Fauth, K. [University Erlangen, Experimental Physics 4, Am Hubland, 97074 Wuerzburg (Germany)

2010-06-23T23:59:59.000Z

318

Evaluation of magnetic flux distribution from magnetic domains in [Co/Pd] nanowires by magnetic domain scope method using contact-scanning of tunneling magnetoresistive sensor  

SciTech Connect

Current-driven magnetic domain wall motions in magnetic nanowires have attracted great interests for physical studies and engineering applications. The magnetic force microscope (MFM) is widely used for indirect verification of domain locations in nanowires, where relative magnetic force between the local domains and the MFM probe is used for detection. However, there is an occasional problem that the magnetic moments of MFM probe influenced and/or rotated the magnetic states in the low-moment nanowires. To solve this issue, the magnetic domain scope for wide area with nano-order resolution (nano-MDS) method has been proposed recently that could detect the magnetic flux distribution from the specimen directly by scanning of tunneling magnetoresistive field sensor. In this study, magnetic domain structure in nanowires was investigated by both MFM and nano-MDS, and the leakage magnetic flux density from the nanowires was measured quantitatively by nano-MDS. Specimen nanowires consisted from [Co (0.3)/Pd (1.2)]{sub 21}/Ru(3) films (units in nm) with perpendicular magnetic anisotropy were fabricated onto Si substrates by dual ion beam sputtering and e-beam lithography. The length and the width of the fabricated nanowires are 20??m and 150?nm. We have succeeded to obtain not only the remanent domain images with the detection of up and down magnetizations as similar as those by MFM but also magnetic flux density distribution from nanowires directly by nano-MDS. The obtained value of maximum leakage magnetic flux by nano-MDS is in good agreement with that of coercivity by magneto-optical Kerr effect microscopy. By changing the protective diamond-like-carbon film thickness on tunneling magnetoresistive sensor, the three-dimensional spatial distribution of leakage magnetic flux could be evaluated.

Okuda, Mitsunobu, E-mail: okuda.m-ky@nhk.or.jp; Miyamoto, Yasuyoshi; Miyashita, Eiichi; Hayashi, Naoto [NHK Science and Technology Research Laboratories, 1-10-11 Kinuta Setagaya, Tokyo 157-8510 (Japan)

2014-05-07T23:59:59.000Z

319

Trapping and Probing Antihydrogen  

SciTech Connect

Precision spectroscopy of antihydrogen is a promising path to sensitive tests of CPT symmetry. The most direct route to achieve this goal is to create and probe antihydrogen in a magnetic minimum trap. Antihydrogen has been synthesized and trapped for 1000s at CERN by the ALPHA Collaboration. Some of the challenges associated with achieving these milestones will be discussed, including mixing cryogenic positron and antiproton plasmas to synthesize antihydrogen with kinetic energy less than the trap potential of .5K. Recent experiments in which hyperfine transitions were resonantly induced with microwaves will be presented. The opportunity for gravitational measurements in traps based on detailed studies of antihydrogen dynamics will be described. The talk will conclude with a discussion future antihydrogen research that will use a new experimental apparatus, ALPHA-I.

Wurtele, Jonathan [UC Berkeley and LBNL

2013-03-27T23:59:59.000Z

320

Scanning electrochemical microscope characterization of thin film combinatorial libraries for fuel cell electrode applications  

Science Journals Connector (OSTI)

PtRu combinatorial libraries of potential fuel cell anode catalysts are formed by sequential sputter deposition through masks onto Si wafers. Scanning electrochemical microscopy (SECM) is employed for characterization of electrocatalytic activity. Aspects of using a scanning electrochemical microscope for characterization of an array of thin film fuel cell electrode materials are discussed. It is shown that in applying SECM to library characterization, careful attention must be paid to thin film annealing, specimen topography and tip degradation in order to realize meaningful results. Results from a PtRu thin film library reveal the most active members near the 50 Pt/50 Ru composition.

M Black; J Cooper; P McGinn

2005-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


321

Microscopy charges ahead | Argonne National Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscopy charges ahead By Jared Sagoff * May 28, 2014 Tweet EmailPrint ARGONNE, Ill. - Ferroelectric materials - substances in which there is a slight and reversible shift of...

322

Rotating concave eddy current probe  

DOE Patents (OSTI)

A rotating concave eddy current probe for detecting fatigue cracks hidden from view underneath the head of a raised head fastener, such as a buttonhead-type rivet, used to join together structural skins, such as aluminum aircraft skins. The probe has a recessed concave dimple in its bottom surface that closely conforms to the shape of the raised head. The concave dimple holds the probe in good alignment on top of the rivet while the probe is rotated around the rivet's centerline. One or more magnetic coils are rigidly embedded within the probe's cylindrical body, which is made of a non-conducting material. This design overcomes the inspection impediment associated with widely varying conductivity in fastened joints.

Roach, Dennis P. (Albuquerque, NM); Walkington, Phil (Albuquerque, NM); Rackow, Kirk A. (Albuquerque, NM); Hohman, Ed (Albuquerque, NM)

2008-04-01T23:59:59.000Z

323

Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope  

E-Print Network (OSTI)

We use a scanning tunneling microscope to probe single-electron charging phenomena in individual CdSe/ZnS (core/shell) quantum dots (QDs) at room temperature. The QDs are deposited on top of a bare Au thin film and form a ...

Bulovic, Vladimir

324

Pump-probe measurements of the thermal conductivity tensor for materials lacking in-plane symmetry  

E-Print Network (OSTI)

1 Pump-probe measurements of the thermal conductivity tensor for materials lacking in conductivity corresponding to the scanning direction. Also, we demonstrate Nb- V as a low thermal conductivity thermal conductivity tensor and the illuminating spots have arbitrary intensity profiles

Cahill, David G.

325

In situ laser processing in a scanning electron microscope  

SciTech Connect

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {micro}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas [University of Tennessee, Knoxville (UTK); Fowlkes, Jason Davidson [ORNL; Rack, Prof. Philip [University of Tennessee, Knoxville (UTK); Moore, Tom [OmniProbe, Inc.; Magel, Greg [OmniProbe, Inc.; Hartfield, Cheryl [OmniProbe, Inc.

2012-01-01T23:59:59.000Z

326

In situ laser processing in a scanning electron microscope  

SciTech Connect

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {mu}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas A.; Magel, Gregory A.; Hartfield, Cheryl D.; Moore, Thomas M.; Fowlkes, Jason D.; Rack, Philip D. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

2012-07-15T23:59:59.000Z

327

Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope  

SciTech Connect

We used a broadband, atomic-force-microscope-based, scanning microwave microscope (SMM) to probe the axial dependence of the charge depletion in a p-n junction within a gallium nitride nanowire (NW). SMM enables the visualization of the p-n junction location without the need to make patterned electrical contacts to the NW. Spatially resolved measurements of S{sub 11}{sup ?}, which is the derivative of the RF reflection coefficient S{sub 11} with respect to voltage, varied strongly when probing axially along the NW and across the p-n junction. The axial variation in S{sub 11}{sup ?}? effectively mapped the asymmetric depletion arising from the doping concentrations on either side of the junction. Furthermore, variation of the probe tip voltage altered the apparent extent of features associated with the p-n junction in S{sub 11}{sup ?} images.

Imtiaz, Atif [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Department of Electrical, Computer, and Energy Engineering, University of Colorado, Boulder, Colorado 80309 (United States); Wallis, Thomas M.; Brubaker, Matt D.; Blanchard, Paul T.; Bertness, Kris A.; Sanford, Norman A.; Kabos, Pavel, E-mail: kabos@boulder.nist.gov [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Weber, Joel C. [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309 (United States); Coakley, Kevin J. [Information Technology Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States)

2014-06-30T23:59:59.000Z

328

Nonlinear Dark-Field Microscopy Hayk Harutyunyan,  

E-Print Network (OSTI)

/20/2010 Published on Web: 11/16/2010 FIGURE 1. Illustration of the nonlinear dark-field imaging method. Two incidentNonlinear Dark-Field Microscopy Hayk Harutyunyan, Stefano Palomba, Jan Renger, Romain Quidant Dark-field microscopy is a background-free imaging method that provides high sensitivity and a large

Novotny, Lukas

329

Faculty Position in Materials Electron Microscopy  

E-Print Network (OSTI)

Faculty Position in Materials Electron Microscopy at the Ecole Polytechnique Fédérale de Lausanne in electron microscopy of materials within its Institute of Materials. We seek exceptional individuals who community. Top-level applications are invited from candidates at the cutting edge of electron microscopic

Candea, George

330

Multiphoton microscopy with near infrared contrast  

E-Print Network (OSTI)

Multiphoton microscopy with near infrared contrast agents Siavash Yazdanfar,a, * Chulmin Joo,a Chun limited to the visible spectrum. We introduce a paradigm for MPM of near-infrared NIR fluorescent Engineers. DOI: 10.1117/1.3420209 Keywords: two-photon microscopy; ultrafast fiber lasers; near-infrared

Larson-Prior, Linda

331

Conducted Electrical Weapon Deployed Probe Wounds  

Science Journals Connector (OSTI)

Deployment of probes is a common method of use for some handheld conducted electrical weapons (CEWs). Probe deployment allows for greater...

Donald M. Dawes M.D.; Jeffrey D. Ho M.D.

2012-01-01T23:59:59.000Z

332

Probing Organic Transistors with Infrared Beams  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Organic Transistors with Infrared Beams Probing Organic Transistors with Infrared Beams Print Wednesday, 26 July 2006 00:00 Silicon-based transistors are well-understood,...

333

Small Quantum Dots Conjugated to Nanobodies as Immunofluorescence Probes for Nanometric Microscopy  

Science Journals Connector (OSTI)

Yong Wang #, En Cai , Tobias Rosenkranz , Pinghua Ge , Kai Wen Teng , Sung Jun Lim ?, Andrew M. Smith ?, Hee Jung Chung ?, Frederick Sachs ??, William N. Green ?, Philip Gottlieb ??, and Paul R. Selvin * ... media. ...

Yong Wang; En Cai; Tobias Rosenkranz; Pinghua Ge; Kai Wen Teng; Sung Jun Lim; Andrew M. Smith; Hee Jung Chung; Frederick Sachs; William N. Green; Philip Gottlieb; Paul R. Selvin

2014-11-14T23:59:59.000Z

334

Influence of Elastic Deformation on Single-Wall Carbon Nanotube Atomic Force Microscopy Probe Resolution  

E-Print Network (OSTI)

Resolution Ian R. Shapiro, Santiago D. Solares,,§ Maria J. Esplandiu,, Lawrence A. Wade,| William A. Goddard,*,,§ and C. Patrick Collier*, Jet Propulsion Laboratory and Departments of Chemistry, Chemical Engineering

Goddard III, William A.

335

On single-molecule DNA sequencing with atomic force microscopy using functionalized carbon nanotube probes  

E-Print Network (OSTI)

A novel DNA sequencing method is proposed based on the specific binding nature of nucleotides and measured by an atomic force microscope (AFM). A single molecule of DNA is denatured and immobilized on an atomically fiat ...

Burns, Daniel James

2004-01-01T23:59:59.000Z

336

Pathophysiology of human red blood cell probed by quantitative phase microscopy by YongKeun Park.  

E-Print Network (OSTI)

There is a strong correlation between the membrane fluctuations and the material properties of living cells. The former, consisting of submicron displacements, can be altered by changing the cells' pathophysiological ...

Park, YongKeun, Ph.D. Massachusetts Institute of Technology

2010-01-01T23:59:59.000Z

337

Atomic force microscopy with carbon nanotube probe resolves the subunit organization of protein complexes  

Science Journals Connector (OSTI)

......synthesized by the conventional DC arc discharge method. Synthesized carbon nanotubes...aligned on a glass plate. An ac electric field of 5 MHz and 1.8 kV cm...Hl-induced compaction in aligned in an arc. The largest subunit was always......

Ken I. Hohmura; Yutakatti Itokazu; Shige H. Yoshimura; Gaku Mizuguchi; Yu-suke Masamura; Kunio Takeyasu; Yasushi Shiomi; Toshiki Tsurimoto; Hidehiro Nishijima; Seiji Akita; Yoshikazu Nakayama

2000-01-01T23:59:59.000Z

338

Viscous Nature of the Bond between Adhering Bacteria and Substratum Surfaces Probed by Atomic Force Microscopy  

Science Journals Connector (OSTI)

University of Groningen and University Medical Center Groningen, Department of Biomedical Engineering Antonius Deusinglaan 1, 9713 AV Groningen, The Netherlands ... *Address: Henny C. van der Mei Department of Biomedical Engineering, FB40 University Medical Center Groningen Antonius Deusinglaan 1, 9713 AV Groningen, The Netherlands. ... This study was entirely funded by the University Medical Center Groningen, Groningen, The Netherlands. ...

Yun Chen; Henny C. van der Mei; Henk J. Busscher; Willem Norde

2014-03-03T23:59:59.000Z

339

Femtosecond pump-probe microscopy generates virtual cross-sections in historic artwork  

Science Journals Connector (OSTI)

...depth penetration by absorption and scattering from the pigment particles. In biology and biomedical applications, nonlinear imaging can provide...Accessed January 4, 2014 . 31 Brinkmann V Wunsche R ( 2007 ) Gods in Color: Painted Sculpture of Classical Antiquity ( Glypotothek...

Tana Elizabeth Villafana; William P. Brown; John K. Delaney; Michael Palmer; Warren S. Warren; Martin C. Fischer

2014-01-01T23:59:59.000Z

340

Solar probe technology challenges  

Science Journals Connector (OSTI)

A mission close to the sun is only possible if new spacecraft technologies can be developed and incorporated into a state?of?the?art spacecraft concept. The perihelion goal of 4 solar radii requires a shielded spacecraft that can tolerate the almost 3000 suns solar flux while maintaining the electronics components at room temperature. In addition the shield surface should sublimate at a rate of less than 3mg/s at perihelion. Many shield configuration designs have been studied and the most promising is a parabolic shape that functions as both a shield and a large high gain antenna. The shield material chosen for this design is a carbon?carbon material with highly emissive surface properties. A mission requirement for a high telecommunications power stems from the expected interference when attempting to transmit data through the solar corona. It is expected that the large carbon?carbon shield/antenna will have a high power gain even at high temperatures and will return adequate telemetry at the X?band radio frequency chosen for the Solar Probe mission. Other key technology needs include a non?nuclear power subsystem that can function in the extreme environments of the mission from Earth to Jupiter and onward to a 4 solar radii perihelion.

James E. Randolph; Robert N. Miyake; Bill J. Nesmith; Ray B. Dirling Jr.; Richard J. Howard

1996-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


341

Long duration ash probe  

DOE Patents (OSTI)

A long duration ash probe includes a pressure shell connected to a port in a combustor with a sample coupon mounted on a retractable carriage so as to retract the sample coupon within the pressure shell during sootblowing operation of the combustor. A valve mounted at the forward end of the pressure shell is selectively closeable to seal the sample coupon within the shell, and a heating element in the shell is operable to maintain the desired temperature of the sample coupon while retracted within the shell. The carriage is operably mounted on a pair of rails within the shell for longitudinal movement within the shell. A hollow carrier tube connects the hollow cylindrical sample coupon to the carriage, and extends through the carriage and out the rearward end thereof. Air lines are connected to the rearward end of the carrier tube and are operable to permit coolant to pass through the air lines and thence through the carrier tube to the sample coupon so as to cool the sample coupon.

Hurley, John P. (Grand Forks, ND); McCollor, Don P. (Grand Forks, ND); Selle, Stanley J. (Grand Forks, MN)

1994-01-01T23:59:59.000Z

342

Long duration ash probe  

DOE Patents (OSTI)

A long duration ash probe includes a pressure shell connected to a port in a combustor with a sample coupon mounted on a retractable carriage so as to retract the sample coupon within the pressure shell during soot blowing operation of the combustor. A valve mounted at the forward end of the pressure shell is selectively closeable to seal the sample coupon within the shell, and a heating element in the shell is operable to maintain the desired temperature of the sample coupon while retracted within the shell. The carriage is operably mounted on a pair of rails within the shell for longitudinal movement within the shell. A hollow carrier tube connects the hollow cylindrical sample coupon to the carriage, and extends through the carriage and out the rearward end thereof. Air lines are connected to the rearward end of the carrier tube and are operable to permit coolant to pass through the air lines and thence through the carrier tube to the sample coupon so as to cool the sample coupon. 8 figs.

Hurley, J.P.; McCollor, D.P.; Selle, S.J.

1994-07-26T23:59:59.000Z

343

Exact probes of orientifolds  

E-Print Network (OSTI)

We compute the exact vacuum expectation value of circular Wilson loops for Euclidean ${\\cal N}=4$ super Yang-Mills with $G=SO(N),Sp(N)$, in the fundamental and spinor representations. These field theories are dual to type IIB string theory compactified on $AdS_5\\times {\\mathbb R} {\\mathbb P}^5$ plus certain choices of discrete torsion, and we use our results to probe this holographic duality. We first revisit the LLM-type geometries having $AdS_5\\times {\\mathbb R} {\\mathbb P}^5$ as ground state. Our results clarify and refine the identification of these LLM-type geometries as bubbling geometries arising from fermions on a half harmonic oscillator. We furthermore identify the presence of discrete torsion with the one-fermion Wigner distribution becoming negative at the origin of phase space. We then turn to the string world-sheet interpretation of our results and argue that for the quantities considered they imply two features: first, the contribution coming from world-sheets with a single crosscap is closely ...

Fiol, Bartomeu; Torrents, Genis

2014-01-01T23:59:59.000Z

344

Differential probes aid flow measurement  

SciTech Connect

Nonconstricting differential pressure flow probes which help solve the problems of clogging, wear, and pressure loss at the Seawater Filtration Facility in Saudi Arabia are described. Treated seawater is pumped into oil-bearing formations for secondary recovery. Figures showing principle of operation for probes, installation schematic and long-term accuracy results (flow probes vs. orifice meters) are presented. The new diamond-shaped design flow sensor offers accurate flow measurement with low permanent pressure loss, which translates into cost savings for the operator.

Mesnard, D.R.

1982-07-01T23:59:59.000Z

345

Optic probe for semiconductor characterization  

DOE Patents (OSTI)

Described herein is an optical probe (120) for use in characterizing surface defects in wafers, such as semiconductor wafers. The optical probe (120) detects laser light reflected from the surface (124) of the wafer (106) within various ranges of angles. Characteristics of defects in the surface (124) of the wafer (106) are determined based on the amount of reflected laser light detected in each of the ranges of angles. Additionally, a wafer characterization system (100) is described that includes the described optical probe (120).

Sopori, Bhushan L. (Denver, CO); Hambarian, Artak (Yerevan, AM)

2008-09-02T23:59:59.000Z

346

Laser-assisted scanning probe alloying nanolithography (LASPAN) and its application in gold-silicon system  

E-Print Network (OSTI)

Nanoscale science and technology demand novel approaches and new knowledge to further advance. Nanoscale fabrication has been widely employed in both modern science and engineering. Micro/nano lithography is the most common technique to deposit...

Peng, Luohan

2009-05-15T23:59:59.000Z

347

Synthesis and characterization of carbon nanotubes using scanning probe based nano-lithographic techniques  

E-Print Network (OSTI)

A novel process which does not require the traditional Chemical Vapor Deposition (CVD) synthesis techniques and which works at temperatures lower than the conventional techniques was developed for synthesis of carbon nanotubes (CNT). The substrates...

Gargate, Rohit Vasant

2009-05-15T23:59:59.000Z

348

Probing Atomic-Scale Properties of Organic and Organometallic Molecules by Scanning Tunneling Spectroscopy  

E-Print Network (OSTI)

LUMO ML NDR NRG rms RT STM STS UHV Density Functional Theorybuilt ultra-high vacuum (UHV) STM. The base pressure is ? 1An overview of the cryogenic UHV STM is shown in figure 5.1.

Yamachika, Ryan

2009-01-01T23:59:59.000Z

349

Development of a Scanning Probe Microscope and Studies of Graphene Grown on Copper  

E-Print Network (OSTI)

of Graphene Grown on Copper (100) Single Crystals, JournalGraphene on Polycrystalline Copper, Nano Letters 11, 251 (5 GRAPHENE GROWTH ON COPPER (100) SINGLE CRYSTALS 5.1

Rasool, Haider Imad

2012-01-01T23:59:59.000Z

350

PDF Rotating Probe VW Dwg  

NLE Websites -- All DOE Office Websites (Extended Search)

7.350 PDF Rotating Probe Drawing 45 T 32 mm bore Top Loading into mixture dilution refrigerator 30 mK< T < 900 mK Heater & Thermometer location 24 pin SIP connector BeCu Spring...

351

President's panel probes sustainable development  

Science Journals Connector (OSTI)

President's panel probes sustainable development ... The President's Council on Sustainable Development, a blue-ribbon advisory panel established by President Bill Clinton last June, held its first meeting outside the nation's capital earlier this month in the Seattle. ...

DEBORAH ILLMAN

1994-01-31T23:59:59.000Z

352

Imaging - Clearer brain scans ... | ornl.gov  

NLE Websites -- All DOE Office Websites (Extended Search)

Imaging - Clearer brain scans ... A clever signal noise reduction strategy developed by a team that includes Oak Ridge National Laboratory's Ben Lawrie could dramatically improve...

353

Differential Scanning Microcalorimetry of Intrinsically Disordered Proteins  

Science Journals Connector (OSTI)

Ultrasensitive differential scanning calorimetry (DSC) is an indispensable thermophysical technique enabling to get direct information on enthalpies accompanying heating/cooling of dilute biopolymer solutions. Th...

Sergei E. Permyakov

2012-01-01T23:59:59.000Z

354

Interpretation of frequency modulation atomic force microscopy in terms of fractional calculus  

Science Journals Connector (OSTI)

It is widely recognized that small amplitude frequency modulation atomic force microscopy probes the derivative of the interaction force between tip and sample. For large amplitudes, however, such a physical connection is currently lacking, although it has been observed that the frequency shift presents a quantity intermediate to the interaction force and energy for certain force laws. Here we prove that these observations are a universal property of large amplitude frequency modulation atomic force microscopy, by establishing that the frequency shift is proportional to the half-fractional integral of the force, regardless of the force law. This finding indicates that frequency modulation atomic force microscopy can be interpreted as a fractional differential operator, where the order of the derivative?integral is dictated by the oscillation amplitude. We also establish that the measured frequency shift varies systematically from a probe of the force gradient for small oscillation amplitudes, through to the measurement of a quantity intermediate to the force and energy (the half-fractional integral of the force) for large oscillation amplitudes. This has significant implications to measurement sensitivity, since integrating the force will smooth its behavior, while differentiating it will enhance variations. This highlights the importance in choice of oscillation amplitude when wishing to optimize the sensitivity of force spectroscopy measurements to short-range interactions and consequently imaging with the highest possible resolution.

John E. Sader and Suzanne P. Jarvis

2004-07-27T23:59:59.000Z

355

City of College Station's Thermographic Mobile Scan  

E-Print Network (OSTI)

During the first quarter of 1986, the City of College Station conducted a thermographic mobile scan of the entire city. A thermographic mobile scan is a process by which heat loss/heat gain data is accumulated by a vehicle traveling the city...

Shear, C. K.

1986-01-01T23:59:59.000Z

356

Dark Field Microscopy for Analytical Laboratory Courses  

Science Journals Connector (OSTI)

An innovative and inexpensive optical microscopy experiment for a quantitative analysis or an instrumental analysis chemistry course is described. The students have hands-on experience with a dark field microscope and investigate the wavelength dependence ...

Ashley E. Augspurger; Anthony S. Stender; Kyle Marchuk; Thomas J. Greenbowe; Ning Fang

2014-05-01T23:59:59.000Z

357

Photon tunnelling microscopy of polyethylene single crystals  

E-Print Network (OSTI)

Photon tunnelling microscopy of polyethylene single crystals Mohan Srinivasarao* and Richard S:photon tunnellingmicroscopy;single crystals; polyethylene) INTRODUCTION The study of morphology of polymers is an area

Srinivasarao, Mohan

358

Subwavelength optical microscopy in the far field  

E-Print Network (OSTI)

We present a procedure for subwavelength optical microscopy. The identical atoms are distributed on a plane and shined with a standing wave. We rotate the plane to different angles and record the resonant fluorescence spectra in the far field, from...

Sun, Qingqing; Al-Amri, M.; Scully, Marlan O.; Zubairy, M. Suhail.

2011-01-01T23:59:59.000Z

359

Bulk Dislocation Core Dissociation Probed by Coherent X Rays in Silicon V. L. R. Jacques,1,2  

E-Print Network (OSTI)

a route for the study of dislocation cores in the bulk in a static or dynamical regime, and under various a few techniques can probe such a discontinuity of space. Transmission electron microscopy (TEM that sheds light on isolated dislocation lines deep inside samples and provides valuable information about

Paris-Sud 11, Université de

360

Neutron and Gamma Probe Application to Hanford Tank 241-SY-101  

SciTech Connect

A neutron (moisture-sensitive) and gamma (in-situ radiation) probe technique has been utilized at a number of Hanford radioactive waste tanks for many years. This technology has been adapted for use in tank 241-SY-101's two Multifunction Instrument Trees (MITs) which have a hollow dry-well center opening two inches (51 cm) in diameter. These probes provide scans starting within a few inches of the tank bottom and traversing up through the top of the tank revealing a variety of waste features as a function of tank elevation. These features have been correlated with void fraction data obtained independently from two other devices, the Retained Gas Sampler (RGS) and the Void Fraction Instrument (VFI). The MIT probes offer the advantage of nearly continuous count-rate versus elevation scans and they can be operated significantly more often and at lower cost than temperature probes or the RGS or VFI devices while providing better depth resolution. The waste level in tank 241-SY-101 had been rising at higher rates than expected during 1998 and early 1999 indicating an increasing amount of trapped gas in the waste. The use of the MIT probes has assisted in evaluating changes in crust thickness and level and also in estimating relative changes in gas stored in the crust. This information is important in assuring that the tank remains in a safe configuration and will support safe waste transfer when those operations take place.

CANNON, N.S.

2000-02-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


361

Hand-held survey probe  

DOE Patents (OSTI)

A system for providing operational feedback to a user of a detection probe may include an optical sensor to generate data corresponding to a position of the detection probe with respect to a surface; a microprocessor to receive the data; a software medium having code to process the data with the microprocessor and pre-programmed parameters, and making a comparison of the data to the parameters; and an indicator device to indicate results of the comparison. A method of providing operational feedback to a user of a detection probe may include generating output data with an optical sensor corresponding to the relative position with respect to a surface; processing the output data, including comparing the output data to pre-programmed parameters; and indicating results of the comparison.

Young, Kevin L. (Idaho Falls, ID) [Idaho Falls, ID; Hungate, Kevin E. (Idaho Falls, ID) [Idaho Falls, ID

2010-02-23T23:59:59.000Z

362

Imaging of Fluorine and Boron from Fluorinated Boronophenylalanine in the Same Cell at Organelle Resolution by Correlative Ion Microscopy and Confocal Laser Scanning Microscopy  

Science Journals Connector (OSTI)

...J. A. Quantitative imaging and microlocalization of boron-10 in brain tumors and infiltrating tumor cells by SIMS ion...R. Quantitative subcellular dynamic SIMS imaging of boron-10 and boron-11 isotopes in the same cell delivered by...

Subhash Chandra; George W. Kabalka; Daniel R. Lorey II; Duane R. Smith; Jeffrey A. Coderre

2002-08-01T23:59:59.000Z

363

In-situ Transmission Electron Microscopy and Spectroscopy Studies...  

NLE Websites -- All DOE Office Websites (Extended Search)

Transmission Electron Microscopy and Spectroscopy Studies of Interfaces in Li-ion Batteries: Challenges and In-situ Transmission Electron Microscopy and Spectroscopy Studies of...

364

Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-High Resolution Electron Microscopy for Catalyst Characterization 2011 DOE Hydrogen and Fuel Cells...

365

Ultra-high Resolution Electron Microscopy for Catalyst Characterizatio...  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

high Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization 2009 DOE Hydrogen Program and Vehicle...

366

Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

High Resolution Electron Microscopy for Catalyst Characterization Ultra-High Resolution Electron Microscopy for Catalyst Characterization 2010 DOE Vehicle Technologies and Hydrogen...

367

Eddy current probe and method for flaw detection in metals  

DOE Patents (OSTI)

A flaw detecting system is shown which includes a probe having a pair of ferrite cores with in-line gaps in close proximity to each other. An insulating, non-magnetic, non-conducting holder fills the gaps and supports the ferrite cores in a manner such that the cores form a generally V-shape. Each core is provided with an excitation winding and a detection winding. The excitation windings are connected in series or parallel with an rf port for connection thereof to a radio frequency source. The detection windings, which are differentially wound, are connected in series circuit to a detector port for connection to a voltage measuring instrument. The ferrite cores at the in-line gaps directly engage the metal surface of a test piece, and the probe is scanned along the test piece. In the presence of a flaw in the metal surface the detection winding voltages are unbalanced, and the unbalance is detected by the voltage measuring instrument. The insulating holder is provided with a profile which conforms to that of a prominent feature of the test piece to facilitate movement of the probe along the feature, typically an edge or a corner. 9 figs.

Watjen, J.P.

1987-06-23T23:59:59.000Z

368

Eddy current probe and method for flaw detection in metals  

DOE Patents (OSTI)

A flaw detecting system is shown which includes a probe having a pair of ferrite cores with in-line gaps in close proximity to each other. An insulating, non-magnetic, non-conducting holder fills the gaps and supports the ferrite cores in a manner such that the cores form a generally V-shape. Each core is provided with an excitation winding and a detection winding. The excitation windings are connected in series or parallel with an rf port for connection thereof to a radio frequency source. The detection windings, which are differentially wound, are connected in series circuit to a detector port for connection to a voltage measuring instrument. The ferrite cores at the in-line gaps directly engage the metal surface of a test piece, and the probe is scanned along the test piece. In the presence of a flaw in the metal surface the detection winding voltages are unbalanced, and the unbalance is detected by the voltage measuring instrument. The insulating holder is provided with a profile which conforms to that of a prominent feature of the test piece to facilitate movement of the probe along the feature, typically an edge or a corner.

Watjen, John P. (Sunnyvale, CA)

1987-06-23T23:59:59.000Z

369

String Scanning in the Icon Programming Language  

Science Journals Connector (OSTI)

...Article String Scanning in the Icon Programming Language R. E. Griswold * Department of Computer Science, The University...general-purpose programming language and describes how they have been introduced in the Icon programming language....

R. E. Griswold

1990-01-01T23:59:59.000Z

370

Transmission Electron Microscope and Scanning Electron Microscopes -  

NLE Websites -- All DOE Office Websites (Extended Search)

Facilities > Transmission Electron Facilities > Transmission Electron Microscope and Scanning Electron Microscopes FACILITIES Transmission Electron Microscope and Scanning Electron Microscopes Overview Other Facilities Work with Argonne Contact us For Employees Site Map Help Join us on Facebook Follow us on Twitter NE on Flickr Transmission Electron Microscope and Scanning Electron Microscopes The research activities of the Corrosion and Mechanics of Materials Section are supported by complete metallography/sample preparation rooms equipped with several optical and electron microscopes: a Transmission Electron Microscope and two Scanning Electron Microscopes. Bookmark and Share Transmission electron microscope (TEM) Detail of JEOL 100CXII TEM Figure 1: Detail of JEOL 100CXII TEM. Click on image to view larger image.

371

Nuclear Physics with Electroweak Probes  

E-Print Network (OSTI)

In recent years, the italian theoretical Nuclear Physics community has played a leading role in the development of a unified approach, allowing for a consistent and fully quantitative description of the nuclear response to electromagnetic and weak probes. In this paper I review the main achievements in both fields, point out some of the open problems, and outline the most promising prospects.

Omar Benhar

2009-02-26T23:59:59.000Z

372

Detecting Plasmon Resonance Energy Transfer with Differential Interference Contrast Microscopy  

SciTech Connect

Gold nanoparticles are ideal probes for studying intracellular environments and energy transfer mechanisms due to their plasmonic properties. Plasmon resonance energy transfer (PRET) relies on a plasmonic nanoparticle to donate energy to a nearby resonant acceptor molecule, a process which can be observed due to the plasmonic quenching of the donor nanoparticle. In this study, a gold nanosphere was used as the plasmonic donor, while the metalloprotein cytochrome c was used as the acceptor molecule. Differential interference contrast (DIC) microscopy allows for simultaneous monitoring of complex environments and noble metal nanoparticles in real time. Using DIC and specially designed microfluidic channels, we were able to monitor PRET at the single gold particle level and observe the reversibility of PRET upon the introduction of phosphate-buffered saline to the channel. In an additional experiment, single gold particles were internalized by HeLa cells and were subsequently observed undergoing PRET as the cell hosts underwent morphological changes brought about by ethanol-induced apoptosis.

Augspurger, Ashley E. [Ames Laboratory; Stender, Anthony S. [Ames Laboratory; Han, Rui [Ames Laboratory; Fang, Ning [Ames Laboratory

2013-12-30T23:59:59.000Z

373

Cantilevered probe detector with piezoelectric element  

DOE Patents (OSTI)

A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

2013-04-30T23:59:59.000Z

374

Scanning tip microwave near field microscope  

DOE Patents (OSTI)

A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

Xiang, Xiao-Dong (Alameda, CA); Schultz, Peter G. (Oakland, CA); Wei, Tao (Albany, CA)

1998-01-01T23:59:59.000Z

375

Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope  

Science Journals Connector (OSTI)

This paper presents a detailed modeling and characterization of a microfabricated cantilever-based scanning microwave probe with separated excitation and sensing electrodes. Using finite-element analysis we model the tip-sample interaction as small impedance changes between the tip electrode and the ground at our working frequencies near 1 GHz . The equivalent lumped elements of the cantilever can be determined by transmission line simulation of the matching network which routes the cantilever signals to 50 ? feed lines. In the microwave electronics the background common-mode signal is canceled before the amplifier stage so that high sensitivity (below 1 aF capacitance changes) is obtained. Experimental characterization of the microwavemicroscope was performed on ion-implanted Si wafers and patterned semiconductor samples. Pure electrical or topographical signals can be obtained from different reflection modes of the probe.

K. Lai; W. Kundhikanjana; M. Kelly; Z. X. Shen

2008-01-01T23:59:59.000Z

376

Development of a Methodology for the Characterisation of Air-coupled Ultrasound Probes  

SciTech Connect

This study is aimed at developing a technique for the characterisation of air-coupled ultrasound probes, starting from the analysis of the mechanical behaviour of the probe membrane. The vibratory behaviour of the emission membrane is studied using laser-Doppler vibrometry techniques with high frequency demodulation system (20 MHz). The determination of the vibration provides information which are useful for the assessment of the performance of the probe, in particular concerning the Quality factor and the portion of the membrane which really contributes to the emission. During the second step the results of the vibration measurements are used to calculate, by means of numerical boundary element method, the ultrasound beam emitted in terms of intensity in space. The obtained field is compared with the direct measurements carried out by scanning with the receiver probe and a pinhole plate. This comparison allows the potential and the problems of the two different characterisation techniques to be determined, even if the pinhole technique (which is currently considered the state of the art) cannot be used as an absolute reference. This study appears to be useful for paving the way for a new methodology for the calibration of air-coupled ultrasound probes, which potentially could be used not only to improve the probe manufacturing process, but also to control conformity to specifications.

Pietroni, Paolo; Marco Revel, Gian [Department of Mechanics, Univ. Politecnica delle Marche, via Brecce Bianche 60131 Ancona (Italy)

2010-05-28T23:59:59.000Z

377

Spatial resolution in vector potential photoelectron microscopy  

SciTech Connect

The experimental spatial resolution of vector potential photoelectron microscopy is found to be much higher than expected because of the cancellation of one of the expected contributions to the point spread function. We present a new calculation of the spatial resolution with support from finite element ray tracing, and experimental results.

Browning, R. [R. Browning Consultants, 1 Barnhart Place, Shoreham, New York 11786 (United States)] [R. Browning Consultants, 1 Barnhart Place, Shoreham, New York 11786 (United States)

2014-03-15T23:59:59.000Z

378

Physical sectioning in 3D biological microscopy  

E-Print Network (OSTI)

developed in the Brain Networks Laboratory at Texas A&M University, has been used for the purpose of this study. However, the modes of characterizing chatter and its measurement are equally applicable to all current variants of 3D biological microscopy using...

Guntupalli, Jyothi Swaroop

2008-10-10T23:59:59.000Z

379

Physical sectioning in 3D biological microscopy  

E-Print Network (OSTI)

developed in the Brain Networks Laboratory at Texas A&M University, has been used for the purpose of this study. However, the modes of characterizing chatter and its measurement are equally applicable to all current variants of 3D biological microscopy using...

Guntupalli, Jyothi Swaroop

2009-05-15T23:59:59.000Z

380

Variable Temperature Ultra-High Vacuum Scanning Tunneling Microscope...  

NLE Websites -- All DOE Office Websites (Extended Search)

Vacuum Scanning Tunneling Microscope The Omicron variable temperature ultra-high vacuum (UHV) scanning tunneling microscope (VTSTM) is designed to study the structure of both clean...

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


381

Downhole probes evaluate cavern integrity  

SciTech Connect

Obtaining natural-gas storage caverns` pressures and temperatures with downhole probes has allowed TransGas Ltd., Regina, to monitor and evaluate cavern integrity. TransGas has more than 5 years` experience with the devices. The acquired data have also helped determine gas-in-place inventory and confirm and assess changes in spatial volumes. These changes may have resulted from cavern creep (shrinkage or closure) or downhole abnormality such as fluid infill or collapse of the side walls or roof. This first of two articles presents background and many of the details and lessons to date of TransGas` cavern gas-storage probe program; the conclusion describes a specific storage site with some results.

Crossley, N.G. [TransGas Ltd., Regina, Saskatchewan (Canada)

1997-03-03T23:59:59.000Z

382

Ethics of reproductive technologies probed  

Science Journals Connector (OSTI)

Ethics of reproductive technologies probed ... Creation of human reproductive technologiessuch as in-vitro fertilization, cryopreservation of embryos, and surrogate motherhood has advanced far more rapidly than development of legal, social, and ethical frameworks to deal with the wave of issues raised. ... The 11-member panel, chaired by Howard W. Jones Jr. of Eastern Virginia Medical School, includes physicians, scientists, lawyers, a theologian, and an ethicist. ...

1986-09-15T23:59:59.000Z

383

pH Meter probe assembly  

DOE Patents (OSTI)

An assembly for mounting a pH probe in a flowing solution, such as a sanitary sewer line, which prevents the sensitive glass portion of the probe from becoming coated with grease, oil, and other contaminants, whereby the probe gives reliable pH indication over an extended period of time. The pH probe assembly utilizes a special filter media and a timed back-rinse feature for flushing clear surface contaminants of the filter. The flushing liquid is of a known pH and is utilized to check performance of the probe.

Hale, Charles J. (San Jose, CA)

1983-01-01T23:59:59.000Z

384

H2Scan LLC | Open Energy Information  

Open Energy Info (EERE)

H2Scan LLC H2Scan LLC Jump to: navigation, search Name H2Scan LLC Place Valencia, California Zip 91355 Sector Hydro, Hydrogen Product Hydrogen specific sensing systems, uniquely able to detect hydrogen against virtually any background gases. Coordinates 39.468791°, -0.376913° Loading map... {"minzoom":false,"mappingservice":"googlemaps3","type":"ROADMAP","zoom":14,"types":["ROADMAP","SATELLITE","HYBRID","TERRAIN"],"geoservice":"google","maxzoom":false,"width":"600px","height":"350px","centre":false,"title":"","label":"","icon":"","visitedicon":"","lines":[],"polygons":[],"circles":[],"rectangles":[],"copycoords":false,"static":false,"wmsoverlay":"","layers":[],"controls":["pan","zoom","type","scale","streetview"],"zoomstyle":"DEFAULT","typestyle":"DEFAULT","autoinfowindows":false,"kml":[],"gkml":[],"fusiontables":[],"resizable":false,"tilt":0,"kmlrezoom":false,"poi":true,"imageoverlays":[],"markercluster":false,"searchmarkers":"","locations":[{"text":"","title":"","link":null,"lat":39.468791,"lon":-0.376913,"alt":0,"address":"","icon":"","group":"","inlineLabel":"","visitedicon":""}]}

385

WorldScan | Open Energy Information  

Open Energy Info (EERE)

WorldScan WorldScan Jump to: navigation, search LEDSGP green logo.png FIND MORE DIA TOOLS This tool is part of the Development Impacts Assessment (DIA) Toolkit from the LEDS Global Partnership. Tool Summary LAUNCH TOOL Name: WorldScan Agency/Company /Organization: Netherlands Bureau for Economic Policy Analysis (CPB) Sector: Climate, Energy Complexity/Ease of Use: Moderate Website: www.gtap.agecon.purdue.edu/resources/res_display.asp?RecordID=1923 Related Tools Marginal Abatement Cost Tool (MACTool) Greenhouse Gas and Air Pollution Interactions and Synergies (GAINS) Gold Standard Program Model ... further results A recursively dynamic general equilibrium model for the world economy, developed for the analysis of long-term issues in international economics; used both as a tool to construct long-term scenarios and as an instrument

386

Aberration-Coreected Electron Microscopy at Brookhaven National Laboratory  

SciTech Connect

The last decade witnessed the rapid development and implementation of aberration correction in electron optics, realizing a more-than-70-year-old dream of aberration-free electron microscopy with a spatial resolution below one angstrom [1-9]. With sophisticated aberration correctors, modern electron microscopes now can reveal local structural information unavailable with neutrons and x-rays, such as the local arrangement of atoms, order/disorder, electronic inhomogeneity, bonding states, spin configuration, quantum confinement, and symmetry breaking [10-17]. Aberration correction through multipole-based correctors, as well as the associated improved stability in accelerating voltage, lens supplies, and goniometers in electron microscopes now enables medium-voltage (200-300kV) microscopes to achieve image resolution at or below 0.1nm. Aberration correction not only improves the instrument's spatial resolution but, equally importantly, allows larger objective lens pole-piece gaps to be employed thus realizing the potential of the instrument as a nanoscale property-measurement tool. That is, while retaining high spatial resolution, we can use various sample stages to observe the materials response under various temperature, electric- and magnetic- fields, and atmospheric environments. Such capabilities afford tremendous opportunities to tackle challenging science and technology issues in physics, chemistry, materials science, and biology. The research goal of the electron microscopy group at the Dept. of Condensed Matter Physics and Materials Science and the Center for Functional Nanomaterials, as well as the Institute for Advanced Electron Microscopy, Brookhaven National Laboratory (BNL), is to elucidate the microscopic origin of the physical- and chemical-behavior of materials, and the role of individual, or groups of atoms, especially in their native functional environments. We plan to accomplish this by developing and implementing various quantitative electron microscopy techniques in strongly correlated electron systems and nanostructured materials. As a first step, with the support of Materials Science Division, Office of Basic Energy Science, US Department of Energy, and the New York State Office of Science, Technology, and Academic Research, recently we acquired three aberration-corrected electron microscopes from the three major microscope manufacturers, i.e., JEOL, Hitachi, and FEI. The Hitachi HD2700C is equipped with a probe corrector, the FEI Titan 80-300 has an imaging corrector, while the JEOL2200MCO has both. All the correctors are of the dual-hexapole type, designed and manufactured by CEOS GmbH based on the design due to Rose and Haider [3, 18]. All these three are one-of-a-kind in the US, designed for specialized capabilities in characterizing nanoscale structure. In this chapter, we review the performance of these state-of-the art instruments and the new challenges associated with the improved spatial resolution, including the environment requirements of the laboratory that hosts these instruments. Although each instrument we describe here has its own strengths and drawbacks, it is not our intention to rank them in terms of their performance, especially their spatial resolution in imaging.

Zhu,Y.; Wall, J.

2008-04-01T23:59:59.000Z

387

Exploration, Registration, and Analysis of High-Throughput 3D Microscopy Data from the Knife-Edge Scanning Microscope  

E-Print Network (OSTI)

connectivity analysis; (2) the size of the uncompressed KESM data exceeds a few terabytes and to compare and combine with other data sets from different imaging modalities, the KESM data must be registered to a standard coordinate space; and (3) quantitative...

Sung, Chul

2014-04-25T23:59:59.000Z

388

Growth of High Aspect Ratio Nanometer-Scale Magnets with Chemical Vapor Deposition and Scanning Tunneling Microscopy  

Science Journals Connector (OSTI)

...50 pA). A contamination coating around a denser Fig. 4...deposit with the contamination coating is thus stable against oxidation...of nanoscale filaments and thin film nucleation and growth theory...Instruments-ARIS 5100 UHV-STM. 13. An optical microscope provides a view...

Andrew D. Kent; Thomas M. Shaw; Stephan von Molnr; David D. Awschalom

1993-11-19T23:59:59.000Z

389

A scanning tunneling microscopy study of atomic-scale clustering in InAsP/InP heterostructures  

E-Print Network (OSTI)

Deer Creek Road, MS 26M-7, Palo Alto, CA 94304. that facilitates population inversion.7 Furthermore, the large conduction-band offset in this material system8 ( Ec

Yu, Edward T.

390

Shearforce-Based Constant-Distance Scanning Electrochemical Microscopy as Fabrication Tool for Needle-Type Carbon-Fiber Nanoelectrodes  

Science Journals Connector (OSTI)

Coating the stems but not the end of the tips of the tapered structures with anodic electrodeposition paint was the strategy for limiting the bare carbon to the foremost end and restricting a feasible voltammetry current response to exactly this section. ... The vibrating carbon fiber tip was fixed in space and the electrochemical cell for the EDP deposition was moved through a stage of three joined stepper motors (SPI Robot Systems, Oppenheim, Germany) with a nominal resolution in x-, y-, and z-direction of 10 nm per microstep. ... Furthermore, electrodeposition paints are com. ...

Emad Mohamed Hussien; Wolfgang Schuhmann; Albert Schulte

2010-06-09T23:59:59.000Z

391

A scanning electron microscopy study of diseased root surfaces conditioned with EDTA gel plus Cetavlon after scaling and root planing  

Science Journals Connector (OSTI)

......analysis The results from the semi-quantitative analysis were evaluated using a nonparametric analysis of variance (Kruskal-Wallis test) followed by a Dunn's post test to compare all pairs of data. Results In control groups 1 and 3, which......

Walter Martins Jnior; Andiara De Rossi; Ricardo Samih Georges Abi Rached; Marcos Antonio Rossi

2011-04-01T23:59:59.000Z

392

Preparation of TiO2(110)-(1x1) Surface via UHV Cleavage: An scanning tunneling microscopy study  

SciTech Connect

TiO2(110) surface was successfully prepared in-situ by UHV cleaving of a commercial TiO2 crystal.. STM imaging revealed atomically flat more than 1 ?m wide terraces with (110) orientation separated by steps running in [001] direction, with very low kink density. Atomically resolved STM images show periodicity in the [001] and [ ] directions with the unit cell parameters measured to ~3 and 6.5 respectively which are closed to the expected values of bulk terminated (1x1) surface.

Bondarchuk, Olexsandr; Lyubinetsky, Igor

2007-11-26T23:59:59.000Z

393

In situ crystallization of barium zinc silicate in glass-ceramics studied by hot stage scanning electron microscopy  

Science Journals Connector (OSTI)

......Glasses and glass ceramics with blue, green and red photoluminescence. Phys. Chem...implications for melt inclusion analysis. Am. Mineral. (2006) 91:667-679. doi:10...formation of gold nanoparticles in soda lime silicate glass: suppressed Ostwald ripening......

Christian Bocker; Marlen Michaelis; Christian Rssel

2012-12-01T23:59:59.000Z

394

Measurement of vibrational spectrum of liquid using monochromated scanning transmission electron microscopyelectron energy loss spectroscopy  

Science Journals Connector (OSTI)

......application to lithium-ion battery and hence has been well studied...Atom-by-atom spectroscopy at graphene edge. Nature (2010) 468...temperature molten salts as lithium battery electrolyte. Electrochim...additive systems as lithium-ion battery ionic liquid electrolytes......

Tomohiro Miyata; Mao Fukuyama; Akihide Hibara; Eiji Okunishi; Masaki Mukai; Teruyasu Mizoguchi

2014-10-01T23:59:59.000Z

395

Three- to two-dimensional transition in electrostatic screening of point charges at semiconductor surfaces studied by scanning tunneling microscopy  

Science Journals Connector (OSTI)

The electrostatic screening of localized electric charges on semiconductor surfaces is investigated quantitatively by statistically analyzing the spatial distribution of thermally formed positively charged anion surface vacancies on GaAs and InP(110) surfaces. Two screening regimes are found: at low vacancy concentrations the vacancy charges are found to be three-dimensionally screened by bulk charge carriers. The corresponding screening length, which increases strongly with decreasing carrier concentration, is best described by the classical bulk screening length evaluated with a surface dielectric constant. With increasing vacancy concentration at given bulk carrier concentration, a three- to two-dimensional screening transition occurs. At high vacancy concentrations, the screening is found to be governed by charge carriers located in a two-dimensional surface vacancy defect band, which is partially filled due to the vacancy-induced surface band bending.

A. Laubsch, K. Urban, and Ph. Ebert

2009-12-14T23:59:59.000Z

396

High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy  

Science Journals Connector (OSTI)

...equal to the beam current per unit area per unit solid angle per unit energy interval, CFE electron sources with their...Monochromated, spatially resolved electron energy-loss spectroscopic measurements of gold nanoparticles in the plasmon range...

2009-01-01T23:59:59.000Z

397

High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy  

Science Journals Connector (OSTI)

...R. F. 1996 Electron energy-loss spectroscopy in...microscope, 2nd edn. New York, NYPlenum. Egerton...Transmission electron energy loss spectrometry in materials...energy-gain spectroscopy. New J. Phys. 10, 1367-2630...

2009-01-01T23:59:59.000Z

398

High resolution in situ magneto-optic Kerr effect and scanning tunneling microscopy setup with all optical components in UHV  

E-Print Network (OSTI)

optical components in UHV A. Lehnert, P. Buluschek, N. Weiss, J. Giesecke, M. Treier, S. Rusponi, and H UHV chamber. In addition, sample preparation, growth of nanostructures or films, as well

Brune, Harald

399

Thin Film Morphology Control by Mechanical, Electronic and Chemical Interactions: a Scanning Tunneling Microscopy and Photoelectron Spectroscopy Study  

E-Print Network (OSTI)

17 UHV System and2-6 Schematic diagram of a my UHV-LT STM design in both top? ? . STM Instrumentation UHV System and Cyrostat In many

Sun, Dezheng

2012-01-01T23:59:59.000Z

400

Classification of Multiple Types of Organic Carbon Composition in Atmospheric Particles by Scanning Transmission X-Ray Microscopy Analysis  

E-Print Network (OSTI)

al. , 2005), and biomass combustion (Braun, 2005; Tivanskigenerated from biomass (wood) combustion, however, it is

Takahama, S.

2008-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


401

Application of Surface Chemical Analysis Tools for Characterization...  

NLE Websites -- All DOE Office Websites (Extended Search)

photoelectron spectroscopy (XPS); time of flight secondary ion mass spectrometry (TOF-SIMS); low energy ion scattering (LEIS); and scanning probe microscopy (SPM), including...

402

E-Print Network 3.0 - afm-based force spectroscopy Sample Search...  

NLE Websites -- All DOE Office Websites (Extended Search)

3 4 5 > >> Page: << < 1 2 3 4 5 > >> 61 Investigation of nanolocal fluorescence resonance energy transfer for scanning probe microscopy Summary: confirmed in another series of...

403

E-Print Network 3.0 - altered nanoscale topographies Sample Search...  

NLE Websites -- All DOE Office Websites (Extended Search)

Bioelectric Scanning Probe Microscopies Summary: . Fumagalli, G. Gomila, et al. Nano Letters (2009) Topography Capacitance Dielectric constant 4. Nanoscale... to measure...

404

Secondary ion mass spectrometry depth profiling of amorphous polymer multilayers using O2  

E-Print Network (OSTI)

experimental techniques such as neutron or x-ray scattering reflectometry NR or XR ,9 scanning probe microscopy. In neutron scattering

405

Probing  

NLE Websites -- All DOE Office Websites (Extended Search)

the understanding of this family of compounds is YMnO 3 , which has a ferrielectric transition at T C 900 K. 3-5 This gives rise to a small distortion of the two-dimensional...

406

LIVE SCAN FINGERPRINTING PROCESS AND RESPONSIBILITIES  

E-Print Network (OSTI)

LIVE SCAN FINGERPRINTING PROCESS AND RESPONSIBILITIES HUMAN RESOURCES Workforce Planning | One of recruitment) to your Workforce Planning Analyst. Notify Finalists Department must notify finalists of the Live. Workforce Planning Analyst will make available at the Human Resources reception desk, the appropriate number

Eirinaki, Magdalini

407

Department of Health I. Internal Scan  

E-Print Network (OSTI)

and cholesterol; and working with consumers, health plans and providers to improve the quality of care and other non- institutional settings. CURRRENT PLANS: The Division of Health care Financing has been takingDepartment of Health I. Internal Scan There are a variety of areas that will be impacted

Tipple, Brett

408

Student Charter Scan the QR-code  

E-Print Network (OSTI)

Student Charter 2013/2014 Scan the QR-code to obtain the online version. TechnischeUniversiteitDelft #12;#12;Student Charter 2013/2014 Delft University of Technology This is the English version of the Student Charter of Delft University of Technology, published on the TU Delft website: www

409

Global registration of dynamic range scans for articulated model reconstruction  

Science Journals Connector (OSTI)

We present the articulated global registration algorithm to reconstruct articulated 3D models from dynamic range scan sequences. This new algorithm aligns multiple range scans simultaneously to reconstruct a full 3D model from the geometry of these scans. ... Keywords: Range scanning, animation reconstruction, articulated model, nonrigid registration

Will Chang; Matthias Zwicker

2011-05-01T23:59:59.000Z

410

New Developments in Transmission Electron Microscopy for Nanotechnology**  

E-Print Network (OSTI)

New Developments in Transmission Electron Microscopy for Nanotechnology** By Zhong Lin Wang* 1. Electron Microscopy and Nanotechnology Nanotechnology, as an international initiative for science manufacturing are the foundation of nanotechnology. Tracking the historical background of why nanotechnology

Wang, Zhong L.

411

Quantitative imaging of living cells by deep ultraviolet microscopy  

E-Print Network (OSTI)

Developments in light microscopy over the past three centuries have opened new windows into cell structure and function, yet many questions remain unanswered by current imaging approaches. Deep ultraviolet microscopy ...

Zeskind, Benjamin J

2006-01-01T23:59:59.000Z

412

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray...

413

Tomography and High-Resolution Electron Microscopy Study of Surfaces...  

NLE Websites -- All DOE Office Websites (Extended Search)

Tomography and High-Resolution Electron Microscopy Study of Surfaces and Porosity in a Plate-Like ?-Al2O3. Tomography and High-Resolution Electron Microscopy Study of...

414

INNOVATIVE EDDY CURRENT PROBE FOR MICRO DEFECTS  

SciTech Connect

This paper reports the development of an innovative eddy current (EC) probe, and its application to micro-defects on the root of the Friction Stir Welding (FSW). The new EC probe presents innovative concept issues, allowing 3D induced current in the material, and a lift-off independence. Validation experiments were performed on aluminium alloys processed by FSW. The results clearly show that the new EC probe is able to detect and sizing surface defects about 60 microns depth.

Santos, Telmo G.; Vilaca, Pedro; Quintino, Luisa [IDMEC, Av. Rovisco Pais, 1049-001 Lisbon (Portugal); Santos, Jorge dos [GKSS, Max-Planck-Street 1, D-21502 Geesthacht (Germany); Rosado, Luis [IST, UTL, Av. Rovisco Pais, 1049-001 Lisbon (Portugal)

2010-02-22T23:59:59.000Z

415

Microsoft Word - PumpProbe  

NLE Websites -- All DOE Office Websites (Extended Search)

Pump/Probe Pump/Probe Resources Available - BE Current Mid 2014 Mid 2016 Beamline X-ray Source Total Total Total NSLS-I 0.25 0.15 0 U4B Bend 0.05 0 0 U4IR Bend 0.2 0.15 0 APS 4.75 4.75 4.75 4-ID-C CPU 0 0 0 7-ID-C&D Undulator 1 1 1 7-BM-B Bend 1 1 1 10-ID-B Undulator 0.5 0.5 0.5 11-ID-D Undulator 1 1 1 14-ID-B Undulator 1 1 1 20-ID Undulator 0.25 0.25 0.25 ALS 3 3 3 4.0.2 EPU 0 0 0 6.0.1 Undulator 1 1 1 6.0.2 Undulator 1 1 1 6.1.2 Bend 0 0 0 9.0.2 Undulator 1 1 1 11.0.1 EPU 0 0 0 11.0.2 EPU 0 0 0 SSRL 0.15 0.45 0.45

416

TRANSMISSION ELECTRON MICROSCOPY OF WEAKLY DEFORMED ALKALI HALIDE CRYSTALS  

E-Print Network (OSTI)

377 TRANSMISSION ELECTRON MICROSCOPY OF WEAKLY DEFORMED ALKALI HALIDE CRYSTALS H. STRUNK Max'importance croissante du durcissement de la solution solide. Abstract. 2014 Transmission electron microscopy (TEM Abstracts 7j66 - 7 I' 1. Introduction. - It is only some years ago that transmission electron microscopy

Boyer, Edmond

417

Synthetic investigation of small-molecule probes.  

E-Print Network (OSTI)

??A series of small molecules was synthesized to probe three protein targets in order to elucidate the key small molecule-protein interactions required for potency. Triclosan (more)

Bromba, Caleb

2012-01-01T23:59:59.000Z

418

Probing Organic Transistors with Infrared Beams  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Organic Transistors with Infrared Beams Print Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is...

419

Rapid Scan AERI Observations: Benefits and Analysis  

NLE Websites -- All DOE Office Websites (Extended Search)

Rapid Scan AERI Observations: Benefits and Analysis Rapid Scan AERI Observations: Benefits and Analysis W. F. Feltz, D. D. Turner, R. O. Knuteson, and R. G. Dedecker Space Science and Engineering Center Cooperative Institute of Mesoscale Meteorological Studies University of Wisconsin-Madison Madison, Wisconsin D. D. Turner Pacific Northwest National Laboratory Richland, Washington Introduction The U.S. Department of Energy's (DOE's) Atmospheric Radiation Measurement (ARM) Program has funded the development of the atmospheric emitted radiance interferometer (AERI). This has led to a hardened, autonomous system that measures downwelling infrared (IR) radiance at high-spectral resolution. Seven AERI systems have been deployed around the world as part of the ARM Program. The initial goal of these instruments was to characterize the clear-sky IR emission from the atmosphere,

420

Circular zig-zag scan video format  

DOE Patents (OSTI)

A circular, ziz-zag scan for use with vidicon tubes. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal.

Peterson, C. Glen (Los Alamos, NM); Simmons, Charles M. (Los Alamos, NM)

1992-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


421

Fast electron microscopy via compressive sensing  

DOE Patents (OSTI)

Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

2014-12-09T23:59:59.000Z

422

High-throughput full-automatic synchrotron-based tomographic microscopy  

SciTech Connect

At the TOMCAT (TOmographic Microscopy and Coherent rAdiology experimenTs) beamline of the Swiss Light Source with an energy range of 8-45 keV and voxel size from 0.37 {micro}m to 7.4 {micro}m, full tomographic datasets are typically acquired in 5 to 10 min. To exploit the speed of the system and enable high-throughput studies to be performed in a fully automatic manner, a package of automation tools has been developed. The samples are automatically exchanged, aligned, moved to the correct region of interest, and scanned. This task is accomplished through the coordination of Python scripts, a robot-based sample-exchange system, sample positioning motors and a CCD camera. The tools are suited for any samples that can be mounted on a standard SEM stub, and require no specific environmental conditions. Up to 60 samples can be analyzed at a time without user intervention. The throughput of the system is dependent on resolution, energy and sample size, but rates of four samples per hour have been achieved with 0.74 {micro}m voxel size at 17.5 keV. The maximum intervention-free scanning time is theoretically unlimited, and in practice experiments have been running unattended as long as 53 h (the average beam time allocation at TOMCAT is 48 h per user). The system is the first fully automated high-throughput tomography station: mounting samples, finding regions of interest, scanning and reconstructing can be performed without user intervention. The system also includes many features which accelerate and simplify the process of tomographic microscopy.

Mader, Kevin; Marone, Federica; Hintermller, Christoph; Mikuljan, Gordan; Isenegger, Andreas; Stampanoni, Marco (SLS)

2011-08-16T23:59:59.000Z

423

Direct Probing of Charge Injection and Polarization-Controlled Ionic Mobility on Ferroelectric LiNbO3 Surfaces  

SciTech Connect

Mapping surface potential with time-resolved Kelvin Probe Force Microscopy (tr-KPFM) in LiNbO3 periodically-poled single crystal revealed activation of the surface ionic subsystem. Electric fields higher than certain threshold value but lower than the switching field induce injection of charge from the biased electrode, formation of an active region in its vicinity and uneven distribution of screening charge on the opposite ferroelectric domains. Tr-KPFM technique allows investigating these phenomena in details.

Strelcov, Evgheni [ORNL] [ORNL; Ievlev, Dr. Anton [Ural State University, Russia] [Ural State University, Russia; Jesse, Stephen [ORNL] [ORNL; Kravchenko, Ivan I [ORNL] [ORNL; Shur, V.Y. [Institute of Physics and Applied Mathematics, Ural State University] [Institute of Physics and Applied Mathematics, Ural State University; Kalinin, Sergei V [ORNL] [ORNL

2014-01-01T23:59:59.000Z

424

Millimeter-wave active probe  

DOE Patents (OSTI)

A millimeter-wave active probe for use in injecting signals with frequencies above 50GHz to millimeter-wave and ultrafast devices and integrated circuits including a substrate upon which a frequency multiplier consisting of filter sections and impedance matching sections are fabricated in uniplanar transmission line format. A coaxial input and uniplanar 50 ohm transmission line couple an approximately 20 GHz input signal to a low pass filter which rolls off at approximately 25 GHz. An input impedance matching section couples the energy from the low pass filter to a pair of matched, antiparallel beam lead diodes. These diodes generate odd-numberd harmonics which are coupled out of the diodes by an output impedance matching network and bandpass filter which suppresses the fundamental and third harmonics and selects the fifth harmonic for presentation at an output.

Majidi-Ahy, Gholamreza (Sunnyvale, CA); Bloom, David M. (Portola Valley, CA)

1991-01-01T23:59:59.000Z

425

MERIT Pump/Probe Data OutlineOutline  

E-Print Network (OSTI)

MERIT Pump/Probe Data Analysis OutlineOutline The pump/probe program Particle detector response correction Pump/probe analysis results NFMCC Collaboration Meeting , LBNL, January 26, 2009 Ilias Efthymiopoulos - CERN #12;The pump/probe program #12;The pump/probe program Use of the CERN PS flexibility

McDonald, Kirk

426

Characterization of grain boundary conductivity of spin-sprayed ferrites using scanning microwave microscope  

SciTech Connect

Grain boundary electrical conductivity of ferrite materials has been characterized using scanning microwave microscope. Structural, electrical, and magnetic properties of Fe{sub 3}O{sub 4} spin-sprayed thin films onto glass substrates for different length of growth times were investigated using a scanning microwave microscope, an atomic force microscope, a four-point probe measurement, and a made in house transmission line based magnetic permeameter. The real part of the magnetic permeability shows almost constant between 10 and 300?MHz. As the Fe{sub 3}O{sub 4} film thickness increases, the grain size becomes larger, leading to a higher DC conductivity. However, the loss in the Fe{sub 3}O{sub 4} films at high frequency does not increase correspondingly. By measuring the reflection coefficient s{sub 11} from the scanning microwave microscope, it turns out that the grain boundaries of the Fe{sub 3}O{sub 4} films exhibit higher electric conductivity than the grains, which contributes loss at radio frequencies. This result will provide guidance for further improvement of low loss ferrite materials for high frequency applications.

Myers, J.; Nicodemus, T.; Zhuang, Y., E-mail: yan.zhuang@wright.edu [Department of Electrical Engineering, Wright State University, Dayton, Ohio 45435 (United States); Watanabe, T.; Matsushita, N. [Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama (Japan); Yamaguchi, M. [Department of Electrical Engineering, Tohoku University, Sendai 980-8579 (Japan)

2014-05-07T23:59:59.000Z

427

Nuclear Imaging Probes: from Bench to Bedside  

Science Journals Connector (OSTI)

...specific imaging probes is the nuclear fuel for molecular imaging by positron emission...cancer. Cancer Res 2001;61:110-7. 24 Price DT, Coleman RE, Liao RP, Robertson CN...specific imaging probes is the nuclear fuel for molecular imaging by positron emission...

Hans-Jrgen Wester

2007-06-15T23:59:59.000Z

428

Rugged fiber optic probe for raman measurement  

DOE Patents (OSTI)

An optical probe for conducting light scattering analysis is disclosed. The probe comprises a hollow housing and a probe tip. A fiber assembly made up of a transmitting fiber and a receiving bundle is inserted in the tip. A filter assembly is inserted in the housing and connected to the fiber assembly. A signal line from the light source and to the spectrometer also is connected to the filter assembly and communicates with the fiber assembly. By using a spring-loaded assembly to hold the fiber connectors together with the in-line filters, complex and sensitive alignment procedures are avoided. The close proximity of the filter assembly to the probe tip eliminates or minimizes self-scattering generated by the optical fiber. Also, because the probe can contact the sample directly, sensitive optics can be eliminated.

O'Rourke, Patrick E. (Martinez, GA); Toole, Jr., William R. (Aiken, SC); Nave, Stanley E. (Evans, GA)

1998-01-01T23:59:59.000Z

429

Individual quantum probes for optimal thermometry  

E-Print Network (OSTI)

The unknown temperature of a sample may be estimated with minimal disturbance by putting it in thermal contact with an individual quantum probe. If the interaction time is sufficiently long so that the probe thermalizes, the temperature can be read out directly from its steady state. Here we prove that the optimal quantum probe, acting as a thermometer with maximal thermal sensitivity, is an effective two-level atom with a maximally degenerate excited state. When the total interaction time is insufficient to produce full thermalization, we optimize the estimation protocol by breaking it down into sequential stages of probe preparation, thermal contact and measurement. We observe that frequently interrogated probes initialized in the ground state achieve the best performance. For both fully and partly thermalized thermometers, the sensitivity grows significantly with the number of levels, though optimization over their energy spectrum remains always crucial.

Luis A. Correa; Mohammad Mehboudi; Gerardo Adesso; Anna Sanpera

2014-11-23T23:59:59.000Z

430

Circular zig-zag scan video format  

DOE Patents (OSTI)

A circular, ziz-zag scan for use with vidicon tubes is disclosed. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal. 10 figs.

Peterson, C.G.; Simmons, C.M.

1992-06-09T23:59:59.000Z

431

MagLab - MagLab Dictionary: Probe (Transcript)  

NLE Websites -- All DOE Office Websites (Extended Search)

means, "stick on which you put the sample," but probe sounds more scientific Listen Audio version Related Links Meet the Probes A magnet without a probe is like a drill without...

432

NCEM National Center for Electron Microscopy: Staff  

NLE Websites -- All DOE Office Websites (Extended Search)

Staff Staff Scientific Technical / Admin. Postdoctoral and Visitors Uli Dahmen, Head Jane Cavlina / Administrator Abhay Gautam Christian Kisielowski John Turner Helmut Poppa Andrew Minor ChengYu Song Frances Allen Andreas Schmid Marissa Libbee Tamara Radetic Peter Ercius Karen Bustillo Haimei Zheng Jim Ciston Alpha N'Diaye Colin Ophus Gong Chen Burak Ozdol Velimir Radmilovic Sara Kiani Hua Guo Christian Liebscher Josh Kacher Chris Nelson Xiuguang Jin Qian Yu Mary Scott Search the LBNL directory services page for other LBNL staff. Scientific Staff Uli Dahmen udahmen@lbl.gov (510) 486-4627 Ulrich Dahmen is Director of the National Center for Electron Microscopy. His current research interests include embedded nanostructures and interfaces in materials. Embedded nanostructures. Size- and shape-dependence of structural phase

433

Advances in cryogenic transmission electron microscopy for the characterization of dynamic self-assembling nanostructures  

Science Journals Connector (OSTI)

Elucidating the structural information of nanoscale materials in their solvent-exposed state is crucial, as a result, cryogenic transmission electron microscopy (cryo-TEM) has become an increasingly popular technique in the materials science, chemistry, and biology communities. Cryo-TEM provides a method to directly visualize the specimen structure in a solution-state through a thin film of vitrified solvent. This technique complements X-ray, neutron, and light scattering methods that probe the statistical average of all species present; furthermore, cryo-TEM can be used to observe changes in structure over time. In the area of self-assembly, this tool has been particularly powerful for the characterization of natural and synthetic small molecule assemblies, as well as hybrid organicinorganic composites. In this review, we discuss recent advances in cryogenic TEM in the context of self-assembling systems with emphasis on characterization of transitions observed in response to external stimuli.

Christina J. Newcomb; Tyson J. Moyer; Sungsoo S. Lee; Samuel I. Stupp

2012-01-01T23:59:59.000Z

434

Applied Scanning Probe Methods II, (2006) Eds. B. Bhushan and H. Fuchs,, Springer-Verlag; Heidelberg (2005) Probing Macromolecular Dynamics and  

E-Print Network (OSTI)

AND REN? M. OVERNEY Department of Chemical Engineering, University of Washington, Box 351750, Seattle, WA Molecular Motion 15 5. Constraints and Structural Modifications near Interfaces 16 5.1 Interfacial Plasticization 16 5.2 Dewetting Kinetics 16 5.3 Disentanglement Barriers 17 5.4 Interfacial Glass Transition

435

Cell-Trappable Fluorescent Probes for Nitric Oxide Visualization in Living Cells  

Science Journals Connector (OSTI)

(2) More recently, NO has been implicated to modulate synaptic activity in the CNS, where it may play a role in signal transduction in the olfactory bulb. ... Using the copper stoichiometry determined by titration, exposure of solutions of the probes generated in situ to excess NO under anaerobic conditions led to an immediate fluorescence enhancement with a concomitant bathochromic shift of the emission maxima (Figure 2 and Table 1). ... To test this presumption, fluorescent protein chimeras were expressed in RAW 264.7 macrophages, and time-lapse ratiometric fluorescence microscopy was used to measure the maturation dynamics of individual phagosomes contg. ...

Michael D. Pluth; Lindsey E. McQuade; Stephen J. Lippard

2010-04-20T23:59:59.000Z

436

A System Level Boundary Scan Controller Board for VME Applications  

Science Journals Connector (OSTI)

In this article an application of boundary scan test at system level is analyzed. The objective is met through the description of the design and implementation options of a VME boundary scan controller board prototype and the corresponding software. ... Keywords: ATPG, IEEE 1149.1 boundary scan test, board level test and system level test

Nuno Cardoso; Carlos Beltrn Almeida; Jos Carlos Da Silva

2001-06-01T23:59:59.000Z

437

Local tunneling characteristics near a grain boundary of a d-wave superconductor as probed by a normal-metal or a low-Tc-superconductor STM tip  

E-Print Network (OSTI)

We studied the local single-particle tunneling characteristics [as observed with scanning tunnel microscopy (STM)] for N D and S D tunneling, where N is a normal metal, S is a s-wave superconductor, and D is a d-wave superconductor with a {100...

Zhao, Hongwei

2005-08-29T23:59:59.000Z

438

Probing Fukushima with cosmic rays should help speed cleanup...  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Fukushima with cosmic rays Probing Fukushima with cosmic rays should help speed cleanup of damaged plant The initiative could reduce the time required to clean up the...

439

Using Rare Gas Permeation to Probe Methanol Diffusion near the...  

NLE Websites -- All DOE Office Websites (Extended Search)

Rare Gas Permeation to Probe Methanol Diffusion near the Glass Transition Temperature. Using Rare Gas Permeation to Probe Methanol Diffusion near the Glass Transition Temperature....

440

Contribution of atom-probe tomography to a better understanding...  

NLE Websites -- All DOE Office Websites (Extended Search)

atom-probe tomography to a better understanding of glass alteration mechanisms: application to a nuclear glass Contribution of atom-probe tomography to a better understanding of...

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


441

Understanding Atom Probe Tomography of Oxide-Supported Metal...  

NLE Websites -- All DOE Office Websites (Extended Search)

Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic Resolution Electron Understanding Atom Probe Tomography of Oxide-Supported Metal...

442

Characterization of Fiber Optic CMM Probe System  

SciTech Connect

This report documents a study completed on the fiber optic probe system that is a part of the Werth optical CMM. This study was necessary due to a lack of documentation from the vendor for the proper use and calibration of the fiber probe, and was performed in support of the Lithographie Galvanoformung Abformung (LIGA) development program at the FM&T. As a result of this study, a better understanding of the fiber optic probe has been developed, including guidelines for its proper use and calibration.

K.W.Swallow

2007-05-15T23:59:59.000Z

443

Acoustic probing of salt using sonar  

E-Print Network (OSTI)

ACOUSTIC PROBING OF SALT USING SONAR A Thesis by KENNETH BRYAN BUTLER Submitted to the Graduate College of Texas A&M University in partial fulfillment of the requirement for the degree of MASTER OF SCIENCE Oecember 1977 Major Subject...: Geophysics ACOUSTIC PROBING OF SALT USING SONAR A Thesis by KENNETH BRYAN BUTLER Approved as to style and content by: C airman of Com ttee ea of e r nt em er ember December 1977 ABSTRACT Acoustic Probing of Salt Using Sonar. (December 1977...

Butler, Kenneth Bryan

2012-06-07T23:59:59.000Z

444

In-Situ Electron Microscopy of Electrical Energy Storage Materials...  

Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials 2011 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies...

445

In-Situ Electron Microscopy of Electrical Energy Storage Materials...  

Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials 2012 DOE Hydrogen and Fuel Cells Program and Vehicle Technologies...

446

Copy of Bound Original For Scanning  

Office of Legacy Management (LM)

Copy of Bound Original Copy of Bound Original For Scanning Document # 1\1\ i g -b DOE/El/-0005/6 Formerly Utilized IVIEWAEC Site! Remedial Action Progrhn, F@diilogical Survey of the Seaway Industrial Par Tonawanda, New Yor May 197 Final Repel Prepared f U.S. Department of Enerc Assistant Secretary for Environme Division of Environmental Control Technolo Washington, D.C. 205, uric Contract No. W-7405-ENG- - - - Available from: ' : -. National Technical Information Service (NTIS) U.S. Department of Comnerce 5285 Port Royal Road Springfield, Virginia 22161 price: Printed Copy: $ 5.25 Microffche: $ 3.00 PREFACE This series of reports results from a program initiated in 1974 by the Atomic Energy Commission (AEC) for determination of the condition of sites formerly utilized by the Manhattan Engineering District &ED)

447

2-M Probe Survey | Open Energy Information  

Open Energy Info (EERE)

2-M Probe Survey 2-M Probe Survey (Redirected from 2-M Probe) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Technique: 2-M Probe Survey Details Activities (27) Areas (21) Regions (0) NEPA(3) Exploration Technique Information Exploration Group: Field Techniques Exploration Sub Group: Data Collection and Mapping Parent Exploration Technique: Data Collection and Mapping Information Provided by Technique Lithology: Stratigraphic/Structural: Hydrological: Thermal: Identify and delineate shallow thermal anomalies Cost Information Low-End Estimate (USD): 200.0020,000 centUSD 0.2 kUSD 2.0e-4 MUSD 2.0e-7 TUSD / station Median Estimate (USD): 300.0030,000 centUSD 0.3 kUSD 3.0e-4 MUSD 3.0e-7 TUSD / station High-End Estimate (USD): 500.0050,000 centUSD 0.5 kUSD 5.0e-4 MUSD

448

Surface sampling concentration and reaction probe  

DOE Patents (OSTI)

A method of analyzing a chemical composition of a specimen is described. The method can include providing a probe comprising an outer capillary tube and an inner capillary tube disposed co-axially within the outer capillary tube, where the inner and outer capillary tubes define a solvent capillary and a sampling capillary in fluid communication with one another at a distal end of the probe; contacting a target site on a surface of a specimen with a solvent in fluid communication with the probe; maintaining a plug volume proximate a solvent-specimen interface, wherein the plug volume is in fluid communication with the probe; draining plug sampling fluid from the plug volume through the sampling capillary; and analyzing a chemical composition of the plug sampling fluid with an analytical instrument. A system for performing the method is also described.

Van Berkel, Gary J; Elnaggar, Mariam S

2013-07-16T23:59:59.000Z

449

Interferometric Probes of Many-Body Localization  

E-Print Network (OSTI)

We propose a method for detecting many-body localization (MBL) in disordered spin systems. The method involves pulsed coherent spin manipulations that probe the dephasing of a given spin due to its entanglement with a set ...

Knap, M.

450

Catheter based magnetic resonance compatible perfusion probe  

E-Print Network (OSTI)

Neurosurgeons are using a thermal based technique to quantify brain perfusion. The thermal diffusion probe (TDP) technology measures perfusion in a relatively small volume of brain tissue. The neurosurgeon chooses the ...

Toretta, Cara Lynne

2007-01-01T23:59:59.000Z

451

Probing Nanostructures for Photovoltaics: Using atomic force microscopy and other tools to characterize nanoscale materials for harvesting solar energy  

E-Print Network (OSTI)

for harvesting solar energy by Anna Monro Zaniewski Amaterials for harvesting solar energy Copyright 2012 by Annafor harvesting solar energy by Anna Monro Zaniewski Doctor

Zaniewski, Anna Monro

2012-01-01T23:59:59.000Z

452

Probing Nanostructures for Photovoltaics: Using atomic force microscopy and other tools to characterize nanoscale materials for harvesting solar energy  

E-Print Network (OSTI)

4.2.1 Organic solar cellOrganic Solar Cells . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.3.1 Organic solar cell materials . . . . .

Zaniewski, Anna Monro

2012-01-01T23:59:59.000Z

453

Probing Nanostructures for Photovoltaics: Using atomic force microscopy and other tools to characterize nanoscale materials for harvesting solar energy  

E-Print Network (OSTI)

an organic solar cell using a single post-production step.Production-scale deposition techniques which have been successfully used for organic solar cellproduction volumes. These two considerations mean that organic solar cells

Zaniewski, Anna Monro

2012-01-01T23:59:59.000Z

454

Specific Visualization of Nitric Oxide in the Vasculature with Two-Photon Microscopy Using a Copper Based Fluorescent Probe  

E-Print Network (OSTI)

To study the role and (sub) cellular nitric oxide (NO) constitution in various disease processes, its direct and specific detection in living cells and tissues is a major requirement. Several methods are available to measure ...

Ghosh, Mitrajit

455

Ferrocenylundecanethiol Self-Assembled Monolayer Charging Correlates with Negative Differential Resistance Measured by Conducting Probe Atomic Force Microscopy  

Science Journals Connector (OSTI)

Additionally, electric force measurements along with theoretical modeling both in and out of contact with a nonelectroactive 1-octanethiol (C8SH) SAM were also performed. ... Using a simple parallel-plate geometry37 and assuming that stored charge is localized on the ferricenium end groups, we find that the quantity of detected charges is Q = 80 20 positive elementary charges or the same number of oxidized molecules if we assume each molecule can store one charge. ... The measurements showed: (1) the I-V traces were linear over 0.3 V, (2) the junction resistance increased exponentially with alkyl chain length, (3) the junction resistance decreased with increasing load and showed two distinct power law scaling regimes, (4) resistances were a factor of 10 lower for junctions based on benzyl thiol SAMs compared to hexyl thiol SAMs having the same thickness, and (5) the junctions sustained fields up to 2 107 V/cm before breakdown. ...

Alexei V. Tivanski; Gilbert C. Walker

2005-05-03T23:59:59.000Z

456

Probing Nanostructures for Photovoltaics: Using atomic force microscopy and other tools to characterize nanoscale materials for harvesting solar energy  

E-Print Network (OSTI)

v List of Tables vii 1 Introduction 1.1 Photovoltaicsand J. V. Manca. Prog. Photovoltaics Res. Appl. , 15:713,polymer blends. Prog. Photovoltaics Res. Appl. , 15:727,

Zaniewski, Anna Monro

2012-01-01T23:59:59.000Z

457

Probing Nanostructures for Photovoltaics: Using atomic force microscopy and other tools to characterize nanoscale materials for harvesting solar energy.  

E-Print Network (OSTI)

??The ability to make materials with nanoscale dimensions opens vast opportunities for creating custom materials with unique properties. The properties of materials on the nanoscale (more)

Zaniewski, Anna Monro

2012-01-01T23:59:59.000Z

458

AdHoc Probe: End-to-end Capacity Probing in Wireless Ad Hoc Networks  

E-Print Network (OSTI)

AdHoc Probe: End-to-end Capacity Probing in Wireless Ad Hoc Networks Ling-Jyh Chen1 , Tony Sun2 and systematic study in ad hoc, multihop wireless networks is still lacking. Yet the rate of a wireless link can deployment. In this paper, we present AdHoc Probe, a packet-pair based technique, to estimate end-to-end path

Chen, Ling-Jyh

459

An electron microscopy study of the microstructure and microarchitecture of the Strombus gigas shell  

SciTech Connect

A scanning and transmission electron microscopy study is presented of the microstructure of the Strombus gigas shell. The hierarchical nature of this crossed-lamellar structure and the defect content of the mineral component are described. The mineral component consists of small single crystal grains of aragonite, the metastable orthorhombic polymorph of CaCO{sub 3}. The habit and morphology of the grains discussed here have not been determined previously. The observed habit and defect structure suggest that the organic matrix exerts a high degree of control over the crystal growth of the mineral phase and is responsible for the long range order in the microarhitecture. Electron beam heating of the mineral component leads to certain phase changes and these are discussed. 15 refs., 6 figs.

Rieke, P.C.; Laraia, V.J. (Pacific Northwest Lab., Richland, WA (USA)); Heuer, A.H. (Case Western Reserve Univ., Cleveland, OH (USA)); Aindow, M. (Ohio State Univ., Columbus, OH (USA))

1989-11-01T23:59:59.000Z

460

Spectral-domain phase microscopy with improved sensitivity using two-dimensional detector arrays  

SciTech Connect

In this work we demonstrate the use of two-dimensional detectors to improve the signal-to-noise ratio (SNR) and sensitivity in spectral-domain phase microscopy for subnanometer accuracy measurements. We show that an increase in SNR can be obtained, from 82 dB to 105 dB, using 150 pixel lines of a low-cost CCD camera as compared to a single line, to compute an averaged axial scan. In optimal mechanical conditions, phase stability as small as 92 {mu}rad, corresponding to 6 pm displacement accuracy, could be obtained. We also experimentally demonstrate the benefit of spatial-averaging in terms of the reduction of signal fading due to an axially moving sample. The applications of the improved system are illustrated by imaging live cells in culture.

Singh, K.; Dion, C.; Ozaki, T. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Institut National de la Recherche Scientifique, Energie, Materiaux et Telecommunications, Varennes, Quebec (Canada); Lesk, M. R. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Departement d'Ophtalmologie, Universite de Montreal, Montreal, Quebec (Canada); Costantino, S. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Departement d'Ophtalmologie, Universite de Montreal, Montreal, Quebec (Canada); Institut de Genie Biomedical, Universite de Montreal, Montreal, Quebec (Canada)

2011-02-15T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


461

Hetero-epitaxial EuO interfaces studied by analytic electron microscopy  

SciTech Connect

With nearly complete spin polarization, the ferromagnetic semiconductor europium monoxide could enable next-generation spintronic devices by providing efficient ohmic spin injection into silicon. Spin injection is greatly affected by the quality of the interface between the injector and silicon. Here, we use atomic-resolution scanning transmission electron microscopy in conjunction with electron energy loss spectroscopy to directly image and chemically characterize a series of EuO|Si and EuO|YAlO{sub 3} interfaces fabricated using different growth conditions. We identify the presence of europium silicides and regions of disorder at the EuO|Si interfaces, imperfections that could significantly reduce spin injection efficiencies via spin-flip scattering.

Mundy, Julia A. [School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853 (United States); Hodash, Daniel; Melville, Alexander; Held, Rainer [Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853 (United States); Mairoser, Thomas; Schmehl, Andreas [Zentrum fr Elektronische Korrelationen und Magnetismus, Universitt Augsburg, Universittsstrae 1, D-86159 Augsburg (Germany); Muller, David A.; Kourkoutis, Lena F. [School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853 (United States); Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853 (United States); Schlom, Darrell G. [Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853 (United States); Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853 (United States)

2014-03-03T23:59:59.000Z

462

Near-field microwave microscopy of high-? oxides grown on graphene with an organic seeding layer  

SciTech Connect

Near-field scanning microwave microscopy (SMM) is used for non-destructive nanoscale characterization of Al{sub 2}O{sub 3} and HfO{sub 2} films grown on epitaxial graphene on SiC by atomic layer deposition using a self-assembled perylene-3,4,9,10-tetracarboxylic dianhydride seeding layer. SMM allows imaging of buried inhomogeneities in the dielectric layer with a spatial resolution close to 100?nm. The results indicate that, while topographic features on the substrate surface cannot be eliminated as possible sites of defect nucleation, the use of a vertically heterogeneous Al{sub 2}O{sub 3}/HfO{sub 2} stack suppresses formation of large outgrowth defects in the oxide film, ultimately improving lateral uniformity of the dielectric film.

Tselev, Alexander, E-mail: tseleva@ornl.gov; Kalinin, Sergei V. [Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge, Tennessee 37831 (United States)] [Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge, Tennessee 37831 (United States); Sangwan, Vinod K.; Jariwala, Deep; Lauhon, Lincoln J. [Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208 (United States)] [Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208 (United States); Marks, Tobin J.; Hersam, Mark C. [Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208 (United States) [Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208 (United States); Department of Chemistry, Northwestern University, Evanston, Illinois 60208 (United States)

2013-12-09T23:59:59.000Z

463

A Transmission Electron Microscopy Study of Presolar Hibonite  

Science Journals Connector (OSTI)

We report isotopic and microstructural data on five presolar hibonite grains (KH1, KH2, KH6, KH15, and KH21) identified in an acid residue of the Krymka LL3.1 ordinary chondrite. Isotopic measurements by secondary ion mass spectrometry (SIMS) verified a presolar circumstellar origin for the grains. Transmission electron microscopy (TEM) examination of the crystal structure and chemistry of the grains was enabled by in situ sectioning and lift-out with a focused-ion-beam scanning-electron microscope (FIB-SEM). Comparisons of isotopic compositions with models indicate that four of the five grains formed in low-mass stars that evolved through the red giant/asymptotic giant branches (RGBs/AGBs), whereas one grain formed in the ejecta of a Type II supernova. Selected-area electron-diffraction patterns show that all grains are single crystals of hibonite. Some grains contain minor structural perturbations (stacking faults) and small spreads in orientation that can be attributed to a combination of growth defects and mechanical processing by grain-grain collisions. The similar structure of the supernova grain to those from RGB/AGB stars indicates a similarity in the formation conditions. Radiation damage (e.g., point defects), if present, occurs below our detection limit. Of the five grains we studied, only one has the pure hibonite composition of CaAl12O19. All others contain minor amounts of Mg, Si, Ti, and Fe. The microstructural data are generally consistent with theoretical predictions, which constrain the circumstellar condensation temperature to a range of 1480-1743K, assuming a corresponding total gas pressure between 1 ? 106 and 1 ? 103atm. The TEM data were also used to develop a calibration for SIMS determination of Ti contents in oxide grains. Grains with extreme 18O depletions, indicating deep mixing has occurred in their parent AGB stars, are slightly Ti enriched compared with grains from stars without deep mixing, most likely reflecting differences in grain condensation conditions.

Thomas J. Zega; Conel M. O'D. Alexander; Larry R. Nittler; Rhonda M. Stroud

2011-01-01T23:59:59.000Z

464

Fiber optic probe for light scattering measurements  

DOE Patents (OSTI)

This invention is comprised of a fiber optic probe and a method for using the probe for light scattering analyses of a sample. The probe includes a probe body with an inlet for admitting a sample into an interior sample chamber, a first optical fiber for transmitting light from a source into the chamber, and a second optical fiber for transmitting light to a detector such as a spectrophotometer. The interior surface of the probe carries a coating that substantially prevents non-scattered light from reaching the second fiber. The probe is placed in a region where the presence and concentration of an analyte of interest are to be detected, and a sample is admitted into the chamber. Exciting light is transmitted into the sample chamber by the first fiber, where the light interacts with the sample to produce Raman-scattered light. At least some of the Raman- scattered light is received by the second fiber and transmitted to the detector for analysis. Two Raman spectra are measured, at different pressures. The first spectrum is subtracted from the second to remove background effects, and the resulting sample Raman spectrum is compared to a set of stored library spectra to determine the presence and concentration of the analyte.

Nave, S.E.; Livingston, R.R.; Prather, W.S.

1993-01-01T23:59:59.000Z

465

Fiber optic probe for light scattering measurements  

DOE Patents (OSTI)

A fiber optic probe and a method for using the probe for light scattering analyses of a sample. The probe includes a probe body with an inlet for admitting a sample into an interior sample chamber, a first optical fiber for transmitting light from a source into the chamber, and a second optical fiber for transmitting light to a detector such as a spectrophotometer. The interior surface of the probe carries a coating that substantially prevents non-scattered light from reaching the second fiber. The probe is placed in a region where the presence and concentration of an analyte of interest are to be detected, and a sample is admitted into the chamber. Exciting light is transmitted into the sample chamber by the first fiber, where the light interacts with the sample to produce Raman-scattered light. At least some of the Raman-scattered light is received by the second fiber and transmitted to the detector for analysis. Two Raman spectra are measured, at different pressures. The first spectrum is subtracted from the second to remove background effects, and the resulting sample Raman spectrum is compared to a set of stored library spectra to determine the presence and concentration of the analyte.

Nave, Stanley E. (Evans, GA); Livingston, Ronald R. (Aiken, SC); Prather, William S. (Augusta, GA)

1995-01-01T23:59:59.000Z

466

Graphene-coated tapered nanowire infrared probe: a comparison with metal-coated probes  

Science Journals Connector (OSTI)

We propose in this paper a graphene-coated tapered nanowire probe providing strong field enhancement in the infrared regimes. The analytical field distributions and characteristic...

Zhu, Bofeng; Ren, Guobin; Gao, Yixiao; Yang, Yang; Lian, Yudong; Jian, Shuisheng

2014-01-01T23:59:59.000Z

467

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope  

SciTech Connect

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p {<=}10{sup -10} mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter [Department of Physics, McGill University, 3600 Rue University, Montreal, QC H3A2T8 (Canada)

2011-11-15T23:59:59.000Z

468

Single Molecule Probes of Lipid Membrane Structure  

E-Print Network (OSTI)

structural metrics with function in biological membranes. Single-molecule fluorescence studies were used to measure membrane structure at the molecular level. Several groups have shown that polarized total internal reflection fluorescence microscopy (PTIRF...

Livanec, Philip W.

2009-12-14T23:59:59.000Z

469

Room temperature electron transport properties of single C{sub 60} studied using scanning tunneling microscope and reak junctions.  

SciTech Connect

We report the measurements of the electron transport of an individual C{sub 60} molecule through the combination of two experimental efforts. The nanometer-sized junctions were fabricated using electromigration combined with electron beam lithography and shadow effect evaporation. We performed the scanning tunneling microscopy/spectroscopy measurements of dispersed C{sub 60} molecules which were deposited on a highly ordered pyrolytic graphite substrate. The single electron tunneling through a single C{sub 60} molecule due to the Coulomb blockage effect is observed at room temperature.

Cheng, R.; Carvell, J.; Fradin, F. Y.; Indiana Univ.-Purdue Univ. at Indianapolis

2010-09-15T23:59:59.000Z

470

Microscopic Analysis of Corn Fiber Using Corn Starch- and Cellulose-Specific Molecular Probes  

SciTech Connect

Ethanol is the primary liquid transportation fuel produced from renewable feedstocks in the United States today. The majority of corn grain, the primary feedstock for ethanol production, has been historically processed in wet mills yielding products such as gluten feed, gluten meal, starch, and germ. Starch extracted from the grain is used to produce ethanol in saccharification and fermentation steps; however the extraction of starch is not 100% efficient. To better understand starch extraction during the wet milling process, we have developed fluorescent probes that can be used to visually localize starch and cellulose in samples using confocal microscopy. These probes are based on the binding specificities of two types of carbohydrate binding modules (CBMs), which are small substrate-specific protein domains derived from carbohydrate degrading enzymes. CBMs were fused, using molecular cloning techniques, to a green fluorescent protein (GFP) or to the red fluorescent protein DsRed (RFP). Using these engineered probes, we found that the binding of the starch-specific probe correlates with starch content in corn fiber samples. We also demonstrate that there is starch internally localized in the endosperm that may contribute to the high starch content in corn fiber. We also surprisingly found that the cellulose-specific probe did not bind to most corn fiber samples, but only to corn fiber that had been hydrolyzed using a thermochemical process that removes the residual starch and much of the hemicellulose. Our findings should be of interest to those working to increase the efficiency of the corn grain to ethanol process.

Porter, S. E.; Donohoe, B. S.; Beery, K. E.; Xu, Q.; Ding, S.-Y.; Vinzant, T. B.; Abbas, C. A.; Himmel, M. E.

2007-09-01T23:59:59.000Z

471

STUDIES OF DENGUE FEVER VIRUS BY ELECTRON MICROSCOPY  

Science Journals Connector (OSTI)

...MICROSCOPY Reginald L. Reagan A. L. Brueckner Live Stock Sanitary Service Laboratory...MICROSCOPY REGINALD L. REAGAN AND A. L. BRUECKNER Live Stock Sanitary Service Laboratory...material 233 REGINALD L. REAGAN AND A. L. BRUECKNER Figure 1. Dengue fever virus (mouse...

Reginald L. Reagan; A. L. Brueckner

1952-08-01T23:59:59.000Z

472

Mach flow angularity probes for scramjet engine flow path diagnostics  

SciTech Connect

Mach-flow angularity (MFA) probes were developed for use in scramjet flow path probe rakes. Prototype probes were fabricated to demonstrate the assembly processes (numerical control machining, furnace brazing, and electron beam welding). Tests of prototype probes confirmed the thermal durability margins and life cycle. Selected probes were calibrated in air at Mach numbers from 1.75 to 6.0. Acceptance criteria for the production probes stressed thermal durability and pressure (and, consequently, Mach number) measurement quality. This new water-cooled MFA probe has 0.397-cm shaft diameter and is capable of withstanding heat fluxes of 2.724 kW/sq cm.

Jalbert, P.A.; Hiers, R.S. Jr. [Sverdrup Technology, Inc., Arnold AFS, TN (United States)

1993-12-31T23:59:59.000Z

473

A near-field scanning microwave microscope based on a superconducting resonator for low power measurements  

E-Print Network (OSTI)

We report on the design and performance of a cryogenic (300 mK) near-field scanning microwave microscope. It uses a microwave resonator as the near-field sensor, operating at a frequency of 6 GHz and microwave probing amplitudes down to 100 uV, approaching low enough photon population (N~1000) of the resonator such that coherent quantum manipulation becomes feasible. The resonator is made out of a miniaturized distributed fractal superconducting circuit that is integrated with the probing tip, micromachined to be compact enough such that it can be mounted directly on a quartz tuning-fork, and used for parallel operation as an atomic force microscope (AFM). The resonator is magnetically coupled to a transmission line for readout, and to achieve enhanced sensitivity we employ a Pound-Drever-Hall measurement scheme to lock to the resonance frequency. We achieve a well localized near-field around the tip such that the microwave resolution is comparable to the AFM resolution, and a capacitive sensitivity down to 6...

de Graaf, S E; Adamyan, A; Kubatkin, S E

2014-01-01T23:59:59.000Z

474

Slow positron annihilation spectroscopy and electron microscopy of electron beam evaporated cobalt and nickel silicides  

SciTech Connect

Metal silicide thin films on single-crystal silicon substrates are the subject of much research, due to their applications as electrical contacts and interconnects, diffusion barriers, low resistance gates, and field-assisted positron moderators, among others. Defects within the silicide layer and/or at the silicide/silicon interface are detrimental to device performance, since they can act as traps for charge carriers, as well as positrons. Pinholes penetrating the film are another detriment particularly for cobalt silicide films, since they allow electrons to permeate the film, rather than travel ballistically, in addition to greatly increasing surface area for recombination events. A series of epitaxial cobalt and nickel silicide thin films, deposited via electron-beam evaporation and annealed at various temperatures, have been grown on single-crystal silicon (111) substrates, in an effort to establish a relationship between deposition and processing parameters and film quality. The films have been analyzed by transmission and scanning electron microscopy, sputter depth profile Auger, and slow positron annihilation spectroscopy. The latter has been shown to both correlate and complement the traditional electron microscopy results.

Frost, R.L.; DeWald, A.B. (Georgia Institute of Technology, Atlanta, Georgia 30332 (USA)); Zaluzec, M.; Rigsbee, J.M. (University of Illinois, Urbana, Illinois 61801 (USA)); Nielsen, B.; Lynn, K.G. (Brookhaven National Laboratory, Upton, New York 11973 (USA))

1990-07-01T23:59:59.000Z

475

V-119: IBM Security AppScan Enterprise Multiple Vulnerabilities |  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

9: IBM Security AppScan Enterprise Multiple Vulnerabilities 9: IBM Security AppScan Enterprise Multiple Vulnerabilities V-119: IBM Security AppScan Enterprise Multiple Vulnerabilities March 26, 2013 - 12:56am Addthis PROBLEM: IBM Security AppScan Enterprise Multiple Vulnerabilities PLATFORM: IBM Rational AppScan 5.x IBM Rational AppScan 8.x ABSTRACT: IBM has acknowledged multiple vulnerabilities REFERENCE LINKS: IBM Reference #:1626264 Secunia Advisory SA52764 CVE-2008-4033 CVE-2012-4431 CVE-2012-5081 CVE-2013-0473 CVE-2013-0474 CVE-2013-0510 CVE-2013-0511 CVE-2013-0512 CVE-2013-0513 CVE-2013-0532 IMPACT ASSESSMENT: Medium DISCUSSION: 1) The application allows users to perform certain actions via HTTP requests without performing proper validity checks to verify the requests. This can be exploited to e.g. cause a DoS when a logged-in user visits a

476

Positron Emission Tomography (PET) and Positron Scanning  

Office of Scientific and Technical Information (OSTI)

DOE R&D Accomplishments DOE R&D Accomplishments Search All Database Web Pages for Go The Basics Home About What's New FAQ Contact Us Laureates Nobel Laureates Fermi Laureates Nobel Physicists Nobel Chemists Medicine Nobels Explore Insights SC Stories Snapshots R&D Nuggets Database Search Browse Reports Database Help Finding Aids Site Map A - Z Index Menu Synopsis Blog Archive QR Code RSS Archive Tag Cloud Videos Widget XML Bookmark and Share Positron Emission Tomography (PET) and Positron Scanning Resources with Additional Information Positron Emission Tomography (PET) Scanner Courtesy Lawrence Berkeley National Laboratory 'Positron Emission Tomography ... [is a medical imaging technique that] can track chemical reactions in living tissues and merges chemistry with biological imaging. Its strength has been in studies of the brain where there has been significant progress in investigations of drug addiction, aging, mental illness, and neurogenic disorders. Positron Emission Tomography (PET) had its genesis in hot-atom chemical research supported by the Chemical Sciences Division of the Office of Basic Energy Sciences. Through this research it was learned, over many years, how to prepare short-lived positron emitters such as 18F whose half-life is 110 minutes. In 1975, the molecule [18F]fluorodeoxyglucose was successfully synthesized at Brookhaven National Laboratory (BNL) and set the stage for Positron Emission Tomography of the human brain.'

477

Lansce Wire Scanning Diagnostics Device Mechanical Design  

SciTech Connect

The Accelerator Operations & Technology Division at Los Alamos National Laboratory operates a linear particle accelerator which utilizes 110 wire scanning diagnostics devices to gain position and intensity information of the proton beam. In the upcoming LANSCE improvements, 51 of these wire scanners are to be replaced with a new design, up-to-date technology and off-the-shelf components. This document outlines the requirements for the mechanical design of the LANSCE wire scanner and presents the recently developed linac wire scanner prototype. Additionally, this document presents the design modifications that have been implemented into the fabrication and assembly of this first linac wire scanner prototype. Also, this document will present the design for the second, third, and fourth wire scanner prototypes being developed. Prototypes 2 and 3 belong to a different section of the particle accelerator and therefore have slightly different design specifications. Prototype 4 is a modification of a previously used wire scanner in our facility. Lastly, the paper concludes with a plan for future work on the wire scanner development.

Rodriguez Esparza, Sergio [Los Alamos National Laboratory; Batygin, Yuri K. [Los Alamos National Laboratory; Gilpatrick, John D. [Los Alamos National Laboratory; Gruchalla, Michael E. [Los Alamos National Laboratory; Maestas, Alfred J. [Los Alamos National Laboratory; Pillai, Chandra [Los Alamos National Laboratory; Raybun, Joseph L. [Los Alamos National Laboratory; Sattler, F. D. [Los Alamos National Laboratory; Sedillo, James Daniel [Los Alamos National Laboratory; Smith, Brian G. [Los Alamos National Laboratory

2011-01-01T23:59:59.000Z

478

A 3D scanning system for biomedical purposes  

Science Journals Connector (OSTI)

The use of three-dimensional (3D) scanning systems for acquiring the external shape features of biological objects has recently been gaining popularity in the biomedical field. A simple, low cost, 3D scanning system is presented, which employs ... Keywords: 3D geometric modelling, 3D scanning, EFDs, biological objects, biomedical scanners, camera calibration, data acquisition, direct linear transformation, elliptical Fourier descriptors, laser light-sectioning, medical imaging, shape features

B. D. Bradley; A. D. C. Chan; M. J. D. Hayes

2009-06-01T23:59:59.000Z

479

The oxidation of aluminum at high temperature studied by Thermogravimetric Analysis and Differential Scanning Calorimetry.  

SciTech Connect

The oxidation in air of high-purity Al foil was studied as a function of temperature using Thermogravimetric Analysis with Differential Scanning Calorimetry (TGA/DSC). The rate and/or extent of oxidation was found to be a non-linear function of the temperature. Between 650 and 750 %C2%B0C very little oxidation took place; at 850 %C2%B0C oxidation occurred after an induction period, while at 950 %C2%B0C oxidation occurred without an induction period. At oxidation temperatures between 1050 and 1150 %C2%B0C rapid passivation of the surface of the aluminum foil occurred, while at 1250 %C2%B0C and above, an initial rapid mass increase was observed, followed by a more gradual increase in mass. The initial rapid increase was accompanied by a significant exotherm. Cross-sections of oxidized specimens were characterized by scanning electron microscopy (SEM); the observed alumina skin thicknesses correlated qualitatively with the observed mass increases.

Coker, Eric Nicholas

2013-10-01T23:59:59.000Z

480

Lightning strokes can probe the ionosphere  

NLE Websites -- All DOE Office Websites (Extended Search)

Lightning Strokes Can Probe Ionosphere Lightning Strokes Can Probe Ionosphere Lightning strokes can probe the ionosphere Researchers have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. April 11, 2013 Lightning. Credit: National Oceanic and Atmospheric Administration (NOAA) The team found that the electron density in the lower ionosphere decreased in response to lightning discharges. Thunderstorms, and the resulting partially ionized plasma of the ionosphere, can distort radio signals traveling to satellites important to communications, navigation or national security Los Alamos researchers and a collaborator have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. This study supports one theory for how tropospheric

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481

Probing Organic Transistors with Infrared Beams  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Organic Transistors with Infrared Beams Print Probing Organic Transistors with Infrared Beams Print Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is growing need for the development of electronic devices based on organic polymer materials. Organic field-effect transistors (FETs) are ideal for special applications that require large areas, light weight, and structural flexibility. They also have the advantage of being easy to mass-produce at very low cost. However, even though this class of devices is finding a growing number of applications, electronic processes in organic materials are still not well understood. A group of researchers from the University of California and the ALS has succeeded in probing the intrinsic electronic properties of the charge carriers in organic FETs using infrared spectromicroscopy. The results of their study could help in the future development of sensors, large-area displays, and other plastic electronic components.

482

Lightning strokes can probe the ionosphere  

NLE Websites -- All DOE Office Websites (Extended Search)

Lightning Strokes Can Probe Ionosphere Lightning Strokes Can Probe Ionosphere Lightning strokes can probe the ionosphere Researchers have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. April 11, 2013 Lightning. Credit: National Oceanic and Atmospheric Administration (NOAA) The team found that the electron density in the lower ionosphere decreased in response to lightning discharges. Thunderstorms, and the resulting partially ionized plasma of the ionosphere, can distort radio signals traveling to satellites important to communications, navigation or national security Los Alamos researchers and a collaborator have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. This study supports one theory for how tropospheric

483

Gamma-ray blind beta particle probe  

DOE Patents (OSTI)

An intra-operative beta particle probe is provided by placing a suitable photomultiplier tube (PMT), micro channel plate (MCP) or other electron multiplier device within a vacuum housing equipped with: 1) an appropriate beta particle permeable window; and 2) electron detection circuitry. Beta particles emitted in the immediate vicinity of the probe window will be received by the electron multiplier device and amplified to produce a detectable signal. Such a device is useful as a gamma insensitive, intra-operative, beta particle probe in surgeries where the patient has been injected with a beta emitting radiopharmaceutical. The method of use of such a device is also described, as is a position sensitive such device.

Weisenberger, Andrew G. (Grafton, VA)

2001-01-01T23:59:59.000Z

484

2-M Probe Survey | Open Energy Information  

Open Energy Info (EERE)

2-M Probe Survey 2-M Probe Survey Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Technique: 2-M Probe Survey Details Activities (27) Areas (21) Regions (0) NEPA(3) Exploration Technique Information Exploration Group: Field Techniques Exploration Sub Group: Data Collection and Mapping Parent Exploration Technique: Data Collection and Mapping Information Provided by Technique Lithology: Stratigraphic/Structural: Hydrological: Thermal: Identify and delineate shallow thermal anomalies Cost Information Low-End Estimate (USD): 200.0020,000 centUSD 0.2 kUSD 2.0e-4 MUSD 2.0e-7 TUSD / station Median Estimate (USD): 300.0030,000 centUSD 0.3 kUSD 3.0e-4 MUSD 3.0e-7 TUSD / station High-End Estimate (USD): 500.0050,000 centUSD 0.5 kUSD 5.0e-4 MUSD 5.0e-7 TUSD / station

485

ProxiScan?: A Novel Camera for Imaging Prostate Cancer  

ScienceCinema (OSTI)

ProxiScan is a compact gamma camera suited for high-resolution imaging of prostate cancer. Developed by Brookhaven National Laboratory and Hybridyne Imaging Technologies, Inc., ProxiScan won a 2009 R&D 100 Award, sponsored by R&D Magazine to recognize t

Ralph James

2010-01-08T23:59:59.000Z

486

Fast 3D Scanning for Biometric Identification and Verification  

E-Print Network (OSTI)

Fast 3D Scanning for Biometric Identification and Verification June 2011 Authors Anselmo., & Chen, A. (2011). Fast 3D Scanning for Biometric Identification and Verification. (Prepared by RTI..................................................10 Summary and Findings for Integration of Imperceptible Structured Lighting and SIS's 3D Snapshot

McShea, Daniel W.

487

NCEM National Center for Electron Microscopy: Becoming an NCEM User  

NLE Websites -- All DOE Office Websites (Extended Search)

New Research New Research Gallery Microscopy Links Becoming an NCEM User Step 1: Submit a proposal Step 2: Before you begin your research Step 3: Instrument qualification Step 4: Accessing NCEM facilities and performing research Step 1: Submit a proposal Deadlines for new proposals are March 15, June 15, September 15, December 15. Access to NCEM facilities is granted to researchers whose proposals are accepted by the NCEM proposal review committee. NCEM users are expected to have a strong background in transmission electron microscopy, and submitted proposals should include evidence of prior electron microscopy experience by the intended operator. Researchers who do not have sufficient experience in electron microscopy may be able to use NCEM facilities through a collaborative project.

488

Measuring Shear Stress in Microfluidics using Traction Force Microscopy  

Science Journals Connector (OSTI)

Traction force microscopy is a previously-developed method to measure shear forces exerted by biological cells on substrates to which they are adhered (Dembo, 1999). The technique determines the shear stress a...

Bryant Mueller

2011-01-01T23:59:59.000Z

489

X-Ray Diffraction Microscopy of Magnetic Structures  

NLE Websites -- All DOE Office Websites (Extended Search)

X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing...

490

Doppler optical coherence microscopy for studies of cochlear mechanics  

E-Print Network (OSTI)

The possibility of measuring subnanometer motions with micron scale spatial resolution in the intact mammalian cochlea using Doppler optical coherence microscopy (DOCM) is demonstrated. A novel DOCM system is described ...

Hong, Stanley S.

491

Fast live simultaneous multiwavelength four-dimensional optical microscopy  

Science Journals Connector (OSTI)

...between excitation power and sensitivity...throughput of both systems. Most modern microscopy systems have excellent...connected to a power source (Bioptechs...Pawley JB ( 2006 ) Handbook of Biological Confocal...image sequence restoration . IEEE T Pattern...

Peter M. Carlton; Jrme Boulanger; Charles Kervrann; Jean-Baptiste Sibarita; Jean Salamero; Susannah Gordon-Messer; Debra Bressan; James E. Haber; Sebastian Haase; Lin Shao; Lukman Winoto; Atsushi Matsuda; Peter Kner; Satoru Uzawa; Mats Gustafsson; Zvi Kam; David A. Agard; John W. Sedat

2010-01-01T23:59:59.000Z

492

Fluorescence microscopy with diffraction resolution barrier broken by stimulated emission  

Science Journals Connector (OSTI)

...intracavity frequency doubler. This system partly converted the Ti:Sapphire...the focused time-averaged power. The axial...processing. Computational image restoration can in addition improve...light. 1 Pawley J ( 1995 ) Handbook of Biological Confocal Microscopy...

Thomas A. Klar; Stefan Jakobs; Marcus Dyba; Alexander Egner; Stefan W. Hell

2000-01-01T23:59:59.000Z

493

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in...

494

Carmichael's Concise Review Microscopy is Only Skin Deep  

E-Print Network (OSTI)

Carmichael's Concise Review Microscopy is Only Skin Deep Stephen W. Carmichael Mayo Clinic. Coming Events 2011 EMAS 2011 May 15­19, 2011 Angers, France www.emas-web.net IUMAS-V May 22­27, 2011

Heller, Eric

495

Toward single cell traction microscopy within 3D collagen matrices  

SciTech Connect

Mechanical interaction between the cell and its extracellular matrix (ECM) regulates cellular behaviors, including proliferation, differentiation, adhesion, and migration. Cells require the three-dimensional (3D) architectural support of the ECM to perform physiologically realistic functions. However, current understanding of cellECM and cellcell mechanical interactions is largely derived from 2D cell traction force microscopy, in which cells are cultured on a flat substrate. 3D cell traction microscopy is emerging for mapping traction fields of single animal cells embedded in either synthetic or natively derived fibrous gels. We discuss here the development of 3D cell traction microscopy, its current limitations, and perspectives on the future of this technology. Emphasis is placed on strategies for applying 3D cell traction microscopy to individual tumor cell migration within collagen gels. - Highlights: Review of the current state of the art in 3D cell traction force microscopy. Bulk and micro-characterization of remodelable fibrous collagen gels. Strategies for performing 3D cell traction microscopy within collagen gels.

Hall, Matthew S. [Department of Biological and Environmental Engineering, Cornell University, Ithaca, NY 14853 (United States); Long, Rong [Department of Mechanical Engineering, University of Alberta, Edmonton, AB, Canada T6G 2G8 (Canada); Feng, Xinzeng [Department of Mechanical and Aerospace Engineering, Cornell University, Ithaca, NY 14853 (United States); Huang, YuLing [Department of Biological and Environmental Engineering, Cornell University, Ithaca, NY 14853 (United States); Hui, Chung-Yuen [Department of Mechanical and Aerospace Engineering, Cornell University, Ithaca, NY 14853 (United States); Wu, Mingming, E-mail: mw272@cornell.edu [Department of Biological and Environmental Engineering, Cornell University, Ithaca, NY 14853 (United States)

2013-10-01T23:59:59.000Z

496

Parameter Scan of an Effective Group Difference Pseudopotential Using Grid Computing 1 Parameter Scan of an Effective Group Difference  

E-Print Network (OSTI)

Parameter Scan of an Effective Group Difference Pseudopotential Using Grid Computing 1 Parameter Scan of an Effective Group Difference Pseudopotential Using Grid Computing Wibke SUDHOLT and Kim K of the actual biology/biochemistry. The ability to invoke modern grid technologies offers the ability to create

Abramson, David

497

Probing Organic Transistors with Infrared Beams  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Organic Transistors with Probing Organic Transistors with Infrared Beams Probing Organic Transistors with Infrared Beams Print Wednesday, 26 July 2006 00:00 Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is growing need for the development of electronic devices based on organic polymer materials. Organic field-effect transistors (FETs) are ideal for special applications that require large areas, light weight, and structural flexibility. They also have the advantage of being easy to mass-produce at very low cost. However, even though this class of devices is finding a growing number of applications, electronic processes in organic materials are still not well understood. A group of researchers from the University of California and the ALS has succeeded in probing the intrinsic electronic properties of the charge carriers in organic FETs using infrared spectromicroscopy. The results of their study could help in the future development of sensors, large-area displays, and other plastic electronic components.

498

Complementarity of future dark energy probes  

Science Journals Connector (OSTI)

......alternative to the standard figure of merit of a survey (Albrecht et al...actually a better figure of merit than the one put forward by...probes discussed have their merits, but weak lensing and baryon...simulation data. We sincerely thank Nick Kaiser for providing us information......

Jiayu Tang; Filipe B. Abdalla; Jochen Weller

2011-09-21T23:59:59.000Z

499

High temperature electrochemical corrosion rate probes  

SciTech Connect

Corrosion occurs in the high temperature sections of energy production plants due to a number of factors: ash deposition, coal composition, thermal gradients, and low NOx conditions, among others. Electrochemical corrosion rate (ECR) probes have been shown to operate in high temperature gaseous environments that are similar to those found in fossil fuel combustors. ECR probes are rarely used in energy production plants at the present time, but if they were more fully understood, corrosion could become a process variable at the control of plant operators. Research is being conducted to understand the nature of these probes. Factors being considered are values selected for the Stern-Geary constant, the effect of internal corrosion, and the presence of conductive corrosion scales and ash deposits. The nature of ECR probes will be explored in a number of different atmospheres and with different electrolytes (ash and corrosion product). Corrosion rates measured using an electrochemical multi-technique capabilities instrument will be compared to those measured using the linear polarization resistance (LPR) technique. In future experiments, electrochemical corrosion rates will be compared to penetration corrosion rates determined using optical profilometry measurements.

Bullard, Sophie J.; Covino, Bernard S., Jr.; Holcomb, Gordon R.; Ziomek-Moroz, M.

2005-09-01T23:59:59.000Z

500

Improvements in 500-kHz Ultrasonic Phased-Array Probe Designs for Evaluation of Thick Section Cast Austenitic Stainless Steel Piping Welds  

SciTech Connect

PNNL has been studying and performing confirmatory research on the inspection of piping welds in coarse-grained steels for over 30 years. More recent efforts have been the application of low frequency phased array technology to this difficult to inspect material. The evolution of 500 kHz PA probes and the associated electronics and scanning protocol are documented in this report. The basis for the probe comparisons are responses from one mechanical fatigue crack and two thermal fatigue cracks in large-bore cast mockup specimens on loan from the Electric Power Research Institution. One of the most significant improvements was seen in the use of piezo-composite elements in the later two probes instead of the piezo-ceramic material used in the prototype array. This allowed a reduction in system gain of 30 dB and greatly reduced electronic noise. The latest probe had as much as a 5 dB increase in signal to noise, adding to its flaw discrimination capability. The system electronics for the latest probe were fully optimized for a 500 kHz center frequency, however significant improvements were not observed in the center frequency of the flaw responses. With improved scanner capabilities, smaller step sizes were used, allowing both line and raster data improvements to be made with the latest probe. The small step sizes produce high resolution images that improve flaw discrimination and, along with the increased signal-to-noise ratio inherent in the latest probe design, enhanced detection of the upper regions of the flaw make depth sizing more plausible. Finally, the physical sizes of the probes were progressively decreased allowing better access to the area of interest on specimens with weld crowns, and the latest probe was designed with non-integral wedges providing flexibility in focusing on different specimen geometries.

Crawford, Susan L.; Cinson, Anthony D.; Moran, Traci L.; Anderson, Michael T.; Diaz, Aaron A.

2011-02-01T23:59:59.000Z