National Library of Energy BETA

Sample records for microscopy scanning probe

  1. Ultrafast scanning probe microscopy

    DOE Patents [OSTI]

    Weiss, S.; Chemla, D.S.; Ogletree, D.F.; Botkin, D.

    1995-05-16

    An ultrafast scanning probe microscopy method is described for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample. 6 Figs.

  2. Ultrafast scanning probe microscopy

    DOE Patents [OSTI]

    Weiss, Shimon (El Cerrito, CA); Chemla, Daniel S. (Kensington, CA); Ogletree, D. Frank (El Cerrito, CA); Botkin, David (San Francisco, CA)

    1995-01-01

    An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.

  3. Scanning probe microscopy competency development

    SciTech Connect (OSTI)

    Hawley, M.E.; Reagor, D.W.; Jia, Quan Xi

    1998-12-31

    This is the final report of a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The project collaborators developed an ultra-high vacuum scanning tunneling microscope (UHV-STM) capability, integrated it with existing scanning probe microscopes, and developed new, advanced air-based scanning force techniques (SPMs). Programmatic, basic, and industrially related laboratory research requires the existence of SPMs, as well as expertise capable of providing local nano-scale information. The UHV-STM capability, equipped with load-lock system and several surface science techniques, will allow introduction, examination, and reaction of surfaces prepared under well-controlled vacuum conditions, including the examination of morphology and local bonding associated with the initial stages of film growth under controlled growth conditions. The resulting capabilities will enable the authors to respond to a variety of problems requiring local characterization of conducting and nonconducting surfaces in liquids, air, and UHV.

  4. Complete information acquisition in scanning probe microscopy

    SciTech Connect (OSTI)

    Belianinov, Alex; Kalinin, Sergei V; Jesse, Stephen

    2015-01-01

    In the last three decades, scanning probe microscopy (SPM) has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of the SPM measurements is the information transfer from the tip-surface junction to a macroscopic measurement system. This process reduces the many degrees of freedom of a vibrating cantilever to relatively few parameters recorded as images. Similarly, the details of dynamic cantilever response at sub-microsecond time scales of transients, higher-order eigenmodes and harmonics are averaged out by transitioning to millisecond time scale of pixel acquisition. Hence, the amount of information available to the external observer is severely limited, and its selection is biased by the chosen data processing method. Here, we report a fundamentally new approach for SPM imaging based on information theory-type analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material s properties and their mutual interactions, and SPM imaging at the information channel capacity limit.

  5. Complete information acquisition in scanning probe microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Belianinov, Alex; Kalinin, Sergei V; Jesse, Stephen

    2015-01-01

    In the last three decades, scanning probe microscopy (SPM) has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of the SPM measurements is the information transfer from the tip-surface junction to a macroscopic measurement system. This process reduces the many degrees of freedom of a vibrating cantilever to relatively few parameters recorded as images. Similarly, the details of dynamic cantilever response at sub-microsecond time scales of transients, higher-order eigenmodes and harmonics are averaged out by transitioning to millisecond time scale of pixel acquisition. Hence, the amount of information available to the external observer ismore » severely limited, and its selection is biased by the chosen data processing method. Here, we report a fundamentally new approach for SPM imaging based on information theory-type analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material s properties and their mutual interactions, and SPM imaging at the information channel capacity limit.« less

  6. Band excitation method applicable to scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen; Kalinin, Sergei V.

    2015-08-04

    Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.

  7. Scanning Probe Microscopy with Spectroscopic Molecular Recognition...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    capable of 5 nm Chemical differentiation of surface features Applications and Industries Atomic force microscopy to study biological and chemical samples Chemical differentiation...

  8. Open Source Scanning Probe Microscopy Control Software package GXSM

    SciTech Connect (OSTI)

    Zahl, P.; Wagner, T.; Moller, R.; Klust, A.

    2010-05-01

    GXSM is a full featured and modern scanning probe microscopy (SPM) software. It can be used for powerful multidimensional image/data processing, analysis, and visualization. Connected to an instrument, it is operating many different flavors of SPM, e.g., scanning tunneling microscopy and atomic force microscopy or, in general, two-dimensional multichannel data acquisition instruments. The GXSM core can handle different data types, e.g., integer and floating point numbers. An easily extendable plug-in architecture provides many image analysis and manipulation functions. A digital signal processor subsystem runs the feedback loop, generates the scanning signals, and acquires the data during SPM measurements. The programmable GXSM vector probe engine performs virtually any thinkable spectroscopy and manipulation task, such as scanning tunneling spectroscopy or tip formation. The GXSM software is released under the GNU general public license and can be obtained via the internet.

  9. Iran Thomas Auditorium, 8600 Transport Measurements by Scanning Probe Microscopy:

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    March 10, 2011 4:00 pm Iran Thomas Auditorium, 8600 Transport Measurements by Scanning Probe Microscopy: Possibilities for Graphene Randall M. Feenstra Department of Physics Carnegie Mellon University CNMS D D I I S S C C O O V V E E R R Y Y SEMINAR SERIES Abstract: In this talk I will present results from various semiconductor materials of the measurement of local carrier transport using scanning probe microscopy, and I will discuss how such measurements might be used for studying epitaxial

  10. Band excitation method applicable to scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen; Kalinin, Sergei V

    2013-05-28

    Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.

  11. Band excitation method applicable to scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen (Knoxville, TN) [Knoxville, TN; Kalinin, Sergei V. (Knoxville, TN) [Knoxville, TN

    2010-08-17

    Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.

  12. Ferroelectric Switching by the Grounded Scanning Probe Microscopy Tip

    SciTech Connect (OSTI)

    Ievlev, Anton; Morozovska, A. N.; Shur, Vladimir Ya.; Kalinin, Sergei V

    2015-01-01

    The process of polarization reversal by the tip of scanning probe microscope was intensively studied for last two decades. Number of the abnormal switching phenomena was reported by the scientific groups worldwide. In particularly it was experimentally and theoretically shown that slow dynamics of the surface screening controls kinetics of the ferroelectric switching, backswitching and relaxation and presence of the charges carriers on the sample surface and in the sample bulk significantly change polarization reversal dynamics. Here we experimentally demonstrated practical possibility of the history dependent polarization reversal by the grounded SPM tip. This phenomenon was attributed to induction of the slowly dissipating charges into the surface of the grounded tip that enables polarization reversal under the action of the produced electric field. Analytical and numerical electrostatic calculations allow additional insight into nontrivial abnormal switching phenomena reported earlier.

  13. Band Excitation Method Applicable to Scanning Probe Microscopy...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter...

  14. Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

    SciTech Connect (OSTI)

    Eliseev, E. A.; Morozovska, A. N.; Ievlev, Anton; Balke, Nina; Maksymovych, Petro; Tselev, Alexander; Kalinin, Sergei V

    2014-01-01

    Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

  15. Exploring Local Electrostatic Effects with Scanning Probe Microscopy: Implications for Piezoresponse Force Microscopy and Triboelectricity

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Balke, Nina; Maksymovych, Petro; Jesse, Stephen; Kravchenko, Ivan I.; Li, Qian; Kalinin, Sergei V.

    2014-09-25

    The implementation of contact mode Kelvin probe force microscopy (KPFM) utilizes the electrostatic interactions between tip and sample when the tip and sample are in contact with each other. Surprisingly, the electrostatic forces in contact are large enough to be measured even with tips as stiff as 4.5 N/m. As for traditional non-contact KPFM, the signal depends strongly on electrical properties of the sample, such as the dielectric constant, and the tip-properties, such as the stiffness. Since the tip is in contact with the sample, bias-induced changes in the junction potential between tip and sample can be measured with highermore » lateral and temporal resolution compared to traditional non-contact KPFM. Significant and reproducible variations of tip-surface capacitance are observed and attributed to surface electrochemical phenomena. Lastly, observations of significant surface charge states at zero bias and strong hysteretic electromechanical responses at non-ferroelectric surface have significant implications for fields such as triboelectricity and piezoresponse force microscopy.« less

  16. Largely defocused probe scanning transmission electron microscopy for imaging local modulation of strain field in a hetero interface

    SciTech Connect (OSTI)

    Kim, Suhyun Jung, Younheum; Kim, Joong Jung; Lee, Sunyoung; Lee, Haebum; Oshima, Yoshifumi

    2014-10-13

    We present an innovative method for characterizing the strain field in three dimensions in a hetero interface. Largely defocused probe scanning transmission electron microscopy (LDP-STEM) was employed for imaging the inhomogeneous strain field in a germanium (Ge) layer deposited on a silicon (Si) substrate. In the LDP-STEM image, Ge-atomic columns that are relaxed or strained to the Si substrate in the Si/Ge hetero interface were observed to be distinguishable, allowing for the qualitative characterization of the coherency of the crystal growth. Our results revealed that the strain field is locally modulated along the in-plane direction in the Si/Ge hetero interface.

  17. Photothermal imaging scanning microscopy

    DOE Patents [OSTI]

    Chinn, Diane (Pleasanton, CA); Stolz, Christopher J. (Lathrop, CA); Wu, Zhouling (Pleasanton, CA); Huber, Robert (Discovery Bay, CA); Weinzapfel, Carolyn (Tracy, CA)

    2006-07-11

    Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.

  18. Evaluation of the electrical contact area in contact-mode scanning probe microscopy

    SciTech Connect (OSTI)

    Celano, Umberto E-mail: u.celano@gmail.com; Chintala, Ravi Chandra; Vandervorst, Wilfried; Hantschel, Thomas; Giammaria, Guido; Conard, Thierry; Bender, Hugo

    2015-06-07

    The tunneling current through an atomic force microscopy (AFM) tip is used to evaluate the effective electrical contact area, which exists between tip and sample in contact-AFM electrical measurements. A simple procedure for the evaluation of the effective electrical contact area is described using conductive atomic force microscopy (C-AFM) in combination with a thin dielectric. We characterize the electrical contact area for coated metal and doped-diamond tips operated at low force (<200 nN) in contact mode. In both cases, we observe that only a small fraction (<10?nm{sup 2}) of the physical contact (?100?nm{sup 2}) is effectively contributing to the transport phenomena. Assuming this reduced area is confined to the central area of the physical contact, these results explain the sub-10?nm electrical resolution observed in C-AFM measurements.

  19. Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen; Kalinin, Sergei V; Nikiforov, Maxim P

    2013-07-09

    An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.

  20. Molecular-Level Insights into Photocatalysis from Scanning Probe Microscopy Studies on TiO2(110)

    SciTech Connect (OSTI)

    Henderson, Michael A.; Lyubinetsky, Igor

    2013-06-12

    The field of heterogeneous photocatalysis has grown considerably in the decades since Fujishima and Honda's ground-breaking publications of photoelectrochemistry on TiO2. Numerous review articles continue to point to both progress made in the use of heterogeneous materials (such as TiO2) to perform photoconversion processes, and the many opportunities and challenges in heterogeneous photocatalysis research such as solar energy conversion and environmental remediation. The past decade has also seen an increase in the use of molecular-level approaches applied to model single crystal surfaces in an effort to obtain new insights into photocatalytic phenomena. In particular, scanning probe techniques (SPM) have enabled researchers to take a nanoscale approach to photocatalysis that includes interrogation of the reactivities of specific sites and adsorbates on a model photocatalyst surface. The rutile TiO2(110) surface has become the prototypical oxide single crystal surface for fundamental studies of many interfacial phenomena. In particular, TiO2(110) has become an excellent model surface for probing photochemical and photocatalytic reactions at the molecular level. A variety of experimental approaches have emerged as being ideally suited for studying photochemical reactions on TiO2(110), including desorption-oriented approaches and electronic spectroscopies, but perhaps the most promising techniques for evaluating site-specific properties are those of SPM. In this review, we highlight the growing use of SPM techniques in providing molecular-level insights into surface photochemistry on the model photocatalyst surface of rutile TiO2(110). Our objective is to both illustrate the unique knowledge that scanning probe techniques have already provided the field of photocatalysis, and also to motivate a new generation of effort into the use of such approaches to obtain new insights into the molecular level details of photochemical events occurring at interfaces. Discussion will start with an examination of how scanning probe techniques are being used to characterize the TiO2(110) surface in ways that are relevant to photocatalysis. We will then discuss specific classes of photochemical reaction on TiO2(110) for which SPM has proven indispensible in providing unique molecular-level insights, and conclude with discussion of future areas in which SPM studies may prove valuable to photocatalysis on TiO2. This work was supported by the US Department of Energy, Office of Basic Energy Sciences, Division of Chemical Sciences, Geosciences & Biosciences. I.L. was partially supported by a Pacific Northwest National Laboratory (PNNL) Chemical Imaging Initiative project. PNNL is a multiprogram national laboratory operated for DOE by Battelle.

  1. Atomic arrangement at ZnTe/CdSe interfaces determined by high resolution scanning transmission electron microscopy and atom probe tomography

    SciTech Connect (OSTI)

    Bonef, Bastien; Rouvire, Jean-Luc; Jouneau, Pierre-Henri; Bellet-Amalric, Edith; Grard, Lionel; Mariette, Henri; Andr, Rgis; Bougerol, Catherine; Grenier, Adeline

    2015-02-02

    High resolution scanning transmission electron microscopy and atom probe tomography experiments reveal the presence of an intermediate layer at the interface between two binary compounds with no common atom, namely, ZnTe and CdSe for samples grown by Molecular Beam Epitaxy under standard conditions. This thin transition layer, of the order of 1 to 3 atomic planes, contains typically one monolayer of ZnSe. Even if it occurs at each interface, the direct interface, i.e., ZnTe on CdSe, is sharper than the reverse one, where the ZnSe layer is likely surrounded by alloyed layers. On the other hand, a CdTe-like interface was never observed. This interface knowledge is crucial to properly design superlattices for optoelectronic applications and to master band-gap engineering.

  2. NREL: Measurements and Characterization - Scanning Electron Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scanning Electron Microscopy Researcher using field-emission scanning electron microscope. Field emission scanning electron microscope (FE-SEM) JEOL 6320F. This FE-SEM equipped with a cold field-emission source and in-lens detectors is designed for ultra-high resolution at low accelerating voltage. Compositional mapping by energy-dispersive microscopy and Electron Backscattered Diffraction are available. In basic scanning electron microscopy (SEM), a beam of highly energetic (0.1-50 keV)

  3. Customized atomic force microscopy probe by focused-ion-beam-assisted tip

    Office of Scientific and Technical Information (OSTI)

    transfer (Journal Article) | SciTech Connect Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer Citation Details In-Document Search Title: Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer We present a technique for transferring separately fabricated tips onto tipless atomic force microscopy (AFM) cantilevers, performed using focused ion beam-assisted nanomanipulation. This method addresses the need in scanning probe microscopy

  4. Sparse sampling and reconstruction for electron and scanning probe microscope imaging

    DOE Patents [OSTI]

    Anderson, Hyrum; Helms, Jovana; Wheeler, Jason W.; Larson, Kurt W.; Rohrer, Brandon R.

    2015-07-28

    Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.

  5. Vertically aligned nanostructure scanning probe microscope tips

    DOE Patents [OSTI]

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  6. Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam; Jesse, Stephen; Kilpatrick, J.; Tselev, Alexander; Okatan, Mahmut Baris; Kalinin, Sergei V.; Rodriguez, Brian

    2015-01-01

    Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q watermore » and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid–liquid interface.« less

  7. Scanning Transmission Electron Microscopy Investigations of Complex Oxides

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    | Stanford Synchrotron Radiation Lightsource Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of Chemistry, University of South Carolina High-Angle-Annular-Dark-Field/Scanning Transmission Electron Microscopy (HAADF/STEM) is a technique uniquely suited for detailed studies of the structure and composition of complex oxides. The HAADF detector collects electrons

  8. Scanning Photocurrent Microscopy of Si and Ge nanowires (Conference) |

    Office of Scientific and Technical Information (OSTI)

    SciTech Connect Conference: Scanning Photocurrent Microscopy of Si and Ge nanowires Citation Details In-Document Search Title: Scanning Photocurrent Microscopy of Si and Ge nanowires × You are accessing a document from the Department of Energy's (DOE) SciTech Connect. This site is a product of DOE's Office of Scientific and Technical Information (OSTI) and is provided as a public service. Visit OSTI to utilize additional information resources in energy science and technology. A paper copy

  9. Modulated microwave microscopy and probes used therewith

    DOE Patents [OSTI]

    Lai, Keji; Kelly, Michael; Shen, Zhi-Xun

    2012-09-11

    A microwave microscope including a probe tip electrode vertically positionable over a sample and projecting downwardly from the end of a cantilever. A transmission line connecting the tip electrode to the electronic control system extends along the cantilever and is separated from a ground plane at the bottom of the cantilever by a dielectric layer. The probe tip may be vertically tapped near or at the sample surface at a low frequency and the microwave signal reflected from the tip/sample interaction is demodulated at the low frequency. Alternatively, a low-frequency electrical signal is also a non-linear electrical element associated with the probe tip to non-linearly interact with the applied microwave signal and the reflected non-linear microwave signal is detected at the low frequency. The non-linear element may be semiconductor junction formed near the apex of the probe tip or be an FET formed at the base of a semiconducting tip.

  10. System and method for compressive scanning electron microscopy

    DOE Patents [OSTI]

    Reed, Bryan W

    2015-01-13

    A scanning transmission electron microscopy (STEM) system is disclosed. The system may make use of an electron beam scanning system configured to generate a plurality of electron beam scans over substantially an entire sample, with each scan varying in electron-illumination intensity over a course of the scan. A signal acquisition system may be used for obtaining at least one of an image, a diffraction pattern, or a spectrum from the scans, the image, diffraction pattern, or spectrum representing only information from at least one of a select subplurality or linear combination of all pixel locations comprising the image. A dataset may be produced from the information. A subsystem may be used for mathematically analyzing the dataset to predict actual information that would have been produced by each pixel location of the image.

  11. Multifocal Multiphoton Laser-Scanning Structured Illumination Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    with Whole-Field Detection - Energy Innovation Portal Multifocal Multiphoton Laser-Scanning Structured Illumination Microscopy with Whole-Field Detection Colorado School of Mines Contact CSM About This Technology Technology Marketing SummaryThis invention describes a multiphoton imaging process in conjunction with whole field detection which gives it the ability to penetrate deeper into highly scattering media. DescriptionThis system may be used for imaging beyond the diffraction limit in

  12. Probing graphene defects and estimating graphene quality with optical microscopy

    SciTech Connect (OSTI)

    Lai, Shen [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Center for Human Interface Nanotechnology (HINT), Suwon 440-746 (Korea, Republic of); Kyu Jang, Sung [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Jae Song, Young, E-mail: yjsong@skku.edu [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Department of Physics, Sungkyunkwan University (SKKU), Suwon 440-746 (Korea, Republic of); Lee, Sungjoo, E-mail: leesj@skku.edu [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Center for Human Interface Nanotechnology (HINT), Suwon 440-746 (Korea, Republic of); College of Information and Communication Engineering, Sungkyunkwan University (SKKU), Suwon 440-746 (Korea, Republic of)

    2014-01-27

    We report a simple and accurate method for detecting graphene defects that utilizes the mild, dry annealing of graphene/Cu films in air. In contrast to previously reported techniques, our simple approach with optical microscopy can determine the density and degree of dislocation of defects in a graphene film without inducing water-related damage or functionalization. Scanning electron microscopy, confocal Raman and atomic force microscopy, and X-ray photoelectron spectroscopy analysis were performed to demonstrate that our nondestructive approach to characterizing graphene defects with optimized thermal annealing provides rapid and comprehensive determinations of graphene quality.

  13. A scanning Kelvin probe analysis of aluminum and aluminum alloys

    SciTech Connect (OSTI)

    Hansen, D.C.; Grecsek, G.E.; Roberts, R.O.

    1999-07-01

    A scanning Kelvin probe was used to determine a correlation between work function measurements in air and corrosion potential measurements in solution of pure metals. Test panels of AA2024-T3 treated with various surface preparations and primer/coatings were also analyzed using this technique. Filiform corrosion was observed on a scribed panel that had been exposed to a humid environment, whereas on a non-scribed and non-exposed test panel, holidays in the coating were observed and clearly defined. Work function (wf) analysis yielded more noble values for areas within the scribe mark and more active values were observed for areas adjacent to the scribe mark where delamination of the coating and filiform corrosion was observed. The tips of corrosion filaments were found to be anodic in relation to the body of the filament, with areas of activity extending away from the filaments themselves. Measurements made on an aircraft access panel resulted in the detection of a potential gradient within the repair area. These results indicate that the scanning Kelvin probe is a useful non-destructive technique for the detection of delamination and disbanding of coatings, coating anomalies and corrosion susceptibility of coatings on aluminum aircraft alloys.

  14. A scanning force microscopy study on the drawing of solution crystallized

    Office of Scientific and Technical Information (OSTI)

    UHMW-PE (Conference) | SciTech Connect Conference: A scanning force microscopy study on the drawing of solution crystallized UHMW-PE Citation Details In-Document Search Title: A scanning force microscopy study on the drawing of solution crystallized UHMW-PE Drawing of solution crystallized UHMW-PE has been monitored by scanning force microscopy (SFM). The work is focused on the transformation of lamellae to fibrilla crystals within the necking region ({lambda} = 1-10). SFM allows

  15. Imaging and quantitative data acquisition of biological cell walls with Atomic Force Microscopy and Scanning Acoustic Microscopy

    SciTech Connect (OSTI)

    Tittmann, B. R.; Xi, X.

    2014-09-01

    This chapter demonstrates the feasibility of Atomic Force Microscopy (AFM) and High Frequency Scanning Acoustic Microscopy (HF-SAM) as tools to characterize biological tissues. Both the AFM and the SAM have shown to provide imaging (with different resolution) and quantitative elasticity measuring abilities. Plant cell walls with minimal disturbance and under conditions of their native state have been examined with these two kinds of microscopy. After descriptions of both the SAM and AFM, their special features and the typical sample preparation is discussed. The sample preparation is focused here on epidermal peels of onion scales and celery epidermis cells which were sectioned for the AFM to visualize the inner surface (closest to the plasma membrane) of the outer epidermal wall. The nm-wide cellulose microfibrils orientation and multilayer structure were clearly observed. The microfibril orientation and alignment tend to be more organized in older scales compared with younger scales. The onion epidermis cell wall was also used as a test analog to study cell wall elasticity by the AFM nanoindentation and the SAM V(z) feature. The novelty in this work was to demonstrate the capability of these two techniques to analyze isolated, single layered plant cell walls in their natural state. AFM nanoindentation was also used to probe the effects of Ethylenediaminetetraacetic acid (EDTA), and calcium ion treatment to modify pectin networks in cell walls. The results suggest a significant modulus increase in the calcium ion treatment and a slight decrease in EDTA treatment. To complement the AFM measurements, the HF-SAM was used to obtain the V(z) signatures of the onion epidermis. These measurements were focused on documenting the effect of pectinase enzyme treatment. The results indicate a significant change in the V(z) signature curves with time into the enzyme treatment. Thus AFM and HF-SAM open the door to a systematic nondestructive structure and mechanical property study of complex biological cell walls. A unique feature of this approach is that both microscopes allow the biological samples to be examined in their natural fluid (water) environment.

  16. Observation of diamond turned OFHC copper using Scanning Tunneling Microscopy

    SciTech Connect (OSTI)

    Grigg, D.A.; Russell, P.E.; Dow, T.A.

    1988-12-01

    Diamond turned OFHC copper samples have been observed within the past few months using the Scanning Tunneling Microscope. Initial results have shown evidence of artifacts which may be used to better understand the diamond turning process. The STM`s high resolution capability and three dimensional data representation allows observation and study of surface features unobtainable with conventional profilometry systems. Also, the STM offers a better quantitative means by which to analyze surface structures than the SEM. This paper discusses findings on several diamond turned OFHC copper samples having different cutting conditions. Each sample has been cross referenced using STM and SEM.

  17. Measuring inside damage of individual multi-walled carbon nanotubes using scanning transmission X-ray microscopy

    SciTech Connect (OSTI)

    Liu, Jinyin; Bai, Lili; Zhao, Guanqi; Sun, Xuhui E-mail: jzhong@suda.edu.cn; Zhong, Jun E-mail: jzhong@suda.edu.cn; Wang, Jian

    2014-06-16

    The electronic structure of individual multi-walled carbon nanotubes (MWCNTs) has been probed using scanning transmission X-ray microscopy (STXM). Although transmission electron microscope (TEM) images show that the exterior of the MWCNTs are clean and straight; the inside structure of some of the MWCNTs is much less well ordered, as revealed by STXM. The amorphization of the interior tubes can be introduced in the growth or modification processes. Moreover, TEM measurement with high dose may also lead to the inside damage. Our results reveal that the structure of individual MWCNTs can be complex and suggest that electronic structure measurements are an important tool for characterizing carbon nanomaterials.

  18. Scanning Near-Field Microwave Microscopy of VO2 and CVD Graphene (Journal

    Office of Scientific and Technical Information (OSTI)

    Article) | SciTech Connect Scanning Near-Field Microwave Microscopy of VO2 and CVD Graphene Citation Details In-Document Search Title: Scanning Near-Field Microwave Microscopy of VO2 and CVD Graphene Authors: Tselev, Alexander [1] ; Lavrik, Nickolay V [1] ; Kolmakov, Andrei [2] ; Kalinin, Sergei V [1] + Show Author Affiliations ORNL Southern Illinois University Publication Date: 2013-01-01 OSTI Identifier: 1079849 DOE Contract Number: DE-AC05-00OR22725 Resource Type: Journal Article Resource

  19. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

    1998-04-28

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

  20. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

    1999-03-09

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

  1. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun (Berkeley, CA); Ogletree, D. Frank (El Cerrito, CA); Salmeron, Miguel (El Cerrito, CA); Xiao, Xudong (Kowloon, CN)

    1999-01-01

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  2. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun (Berkeley, CA); Ogletree, D. Frank (El Cerrito, CA); Salmeron, Miguel (El Cerrito, CA); Xiao, Xudong (Kowloon, CN)

    1998-01-01

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  3. Diffraction barrier breakthrough in coherent anti-Stokes Raman scattering microscopy by additional probe-beam-induced phonon depletion

    SciTech Connect (OSTI)

    Liu Wei; Niu Hanben

    2011-02-15

    We provide an approach to significantly break the diffraction limit in coherent anti-Stokes Raman scattering (CARS) microscopy via an additional probe-beam-induced photon depletion (APIPD). The additional probe beam, whose profile is doughnut shaped and whose wavelength is different from the Gaussian probe beam, depletes the phonons to yield an unwanted anti-Stokes signal within a certain bandwidth at the rim of the diffraction-limited spot. When the Gaussian probe beam that follows immediately arrives, no anti-Stokes signal is generated in this region, resembling stimulated emission depletion (STED) microscopy, and the spot-generating useful anti-Stokes signals by this beam are substantially suppressed to a much smaller dimension. Scanning the spot renders three-dimensional, label-free, and chemically selective CARS images with subdiffraction resolution. Also, resolution-enhanced images of the molecule, specified by its broadband even-total CARS spectral signals not only by one anti-Stokes signal for its special chemical bond, can be obtained by employing a supercontinuum source.

  4. X-ray optics for scanning fluorescence microscopy and other applications

    SciTech Connect (OSTI)

    Ryon, R.W.; Warburton, W.K.

    1992-05-01

    Scanning x-ray fluorescence microscopy is analogous to scanning electron microscopy. Maps of chemical element distribution are produced by scanning with a very small x-ray beam. Goal is to perform such scanning microscopy with resolution in the range of <1 to 10 {mu}m, using standard laboratory x-ray tubes. We are investigating mirror optics in the Kirkpatrick-Baez (K-B) configuration. K-B optics uses two curved mirrors mounted orthogonally along the optical axis. The first mirror provides vertical focus, the second mirror provides horizontal focus. We have used two types of mirrors: synthetic multilayers and crystals. Multilayer mirrors are used with lower energy radiation such as Cu K{alpha}. At higher energies such as Ag K{alpha}, silicon wafers are used in order to increase the incidence angles and thereby the photon collection efficiency. In order to increase the surface area of multilayers which reflects x-rays at the Bragg angle, we have designed mirrors with the spacing between layers graded along the optic axis in order to compensate for the changing angle of incidence. Likewise, to achieve a large reflecting surface with silicon, the wafers are placed on a specially designed lever arm which is bent into a log spiral by applying force at one end. In this way, the same diffracting angle is maintained over the entire surface of the wafer, providing a large solid angle for photon collection.

  5. Atom probe field ion microscopy and related topics: A bibliography 1990

    SciTech Connect (OSTI)

    Russell, K.F.; Miller, M.K.

    1991-12-01

    This bibliography includes references related to the following topics: atom probe field ion microscopy (APFIM), field ion microscopy (FIM), field emission (FE), ion sources, and field desorption mass microscopy (FDMM). Technique-orientated studies and applications are included. The bibliography covers the period 1990. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references, listed alphabetically by authors, are subdivided into the categories listed in paragraph one above. An Addendum of references missed in previous bibliographies is included.

  6. A variable-width harmonic probe for multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Cai, Jiandong; Zhang, Li; Xia, Qi E-mail: michael.wang@nus.edu.sg; Luo, Yangjun; Wang, Michael Yu E-mail: michael.wang@nus.edu.sg

    2015-02-16

    In multifrequency atomic force microscopy (AFM) to simultaneously measure topography and material properties of specimens, it is highly desirable that the higher order resonance frequencies of the cantilever probe are assigned to be integer harmonics of the excitation frequency. The harmonic resonances are essential for significant enhancement of the probe's response at the specified harmonic frequencies. In this letter, a structural optimization technique is employed to design cantilever probes so that the ratios between one or more higher order resonance frequencies and the fundamental natural frequency are ensured to be equal to specified integers and, in the meantime, that the fundamental natural frequency is maximized. Width profile of the cantilever probe is the design variable in optimization. Thereafter, the probes were prepared by modifying a commercial probe through the focused ion beam (FIB) milling. The resonance frequencies of the FIB fabricated probes were measured with an AFM. Results of the measurement show that the optimal design of probe is as effective as design prediction.

  7. Synchronous digitization for high dynamic range lock-in amplification in beam-scanning microscopy

    SciTech Connect (OSTI)

    Muir, Ryan D.; Sullivan, Shane Z.; Oglesbee, Robert A.; Simpson, Garth J.

    2014-03-15

    Digital lock-in amplification (LIA) with synchronous digitization (SD) is shown to provide significant signal to noise (S/N) and linear dynamic range advantages in beam-scanning microscopy measurements using pulsed laser sources. Direct comparisons between SD-LIA and conventional LIA in homodyne second harmonic generation measurements resulted in S/N enhancements consistent with theoretical models. SD-LIA provided notably larger S/N enhancements in the limit of low light intensities, through the smooth transition between photon counting and signal averaging developed in previous work. Rapid beam scanning instrumentation with up to video rate acquisition speeds minimized photo-induced sample damage. The corresponding increased allowance for higher laser power without sample damage is advantageous for increasing the observed signal content.

  8. Low temperature laser scanning microscopy of a superconducting radio-frequency cavity

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ciovati, G.; Anlage, Steven M.; Baldwin, C.; Cheng, G.; Flood, R.; Jordan, K.; Kneisel, P.; Morrone, M.; Nemes, G.; Turlington, L.; et al

    2012-03-16

    An apparatus was created to obtain, for the first time, 2D maps of the surface resistance of the inner surface of an operating superconducting radio-frequency niobium cavity by a low-temperature laser scanning microscopy technique. This allows identifying non-uniformities of the surface resistance with a spatial resolution of about one order of magnitude better than with earlier methods. A signal-to-noise ratio of about 10 dB was obtained with 240 mW laser power and 1 Hz modulation frequency. The various components of the apparatus, the experimental procedure and results are discussed in details in this contribution.

  9. Charge ordering in stoichiometric FeTe: Scanning tunneling microscopy and spectroscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Li, Wei; Yin, Wei -Guo; Wang, Lili; He, Ke; Ma, Xucun; Xue, Qi -Kun; Chen, Xi

    2016-01-04

    In this study, we use scanning tunneling microscopy and spectroscopy to reveal a unique stripy charge order in a parent phase of iron-based superconductors in stoichiometric FeTe epitaxy films. The charge order has unusually the same—usually half—period as the spin order. We also found highly anisotropic electron band dispersions being large and little along the ferromagnetic (crystallographic b) and antiferromagnetic (a) directions, respectively. Our data suggest that the microscopic mechanism is likely of the Stoner type driven by interatomic Coulomb repulsion Vij, and that Vij and charge fluctuations, so far much neglected, are important to the understanding of iron-based superconductors.

  10. Imaging and microanalysis of thin ionomer layers by scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Cullen, David A; Koestner, Roland; Kukreja, Ratan; Minko, Sergiy; Trotsenko, Oleksandr; Tokarev, Alexander V; Guetaz, Laure; Meyer III, Harry M; Parish, Chad M; More, Karren Leslie

    2014-01-01

    Improved conditions for imaging and spectroscopic mapping of thin perfluorosulfonic acid (PFSA) ionomer layers in fuel cell electrodes by scanning transmission electron microscopy (STEM) have been investigated. These conditions are first identified on model systems of Nafion ionomer-coated nanostructured thin films and nanoporous Si. The optimized conditions are then applied in a quantitative study of the ionomer through-layer loading for two typical electrode catalyst coatings using electron energy loss and energy dispersive X-ray spectroscopy in the transmission electron microscope. The e-beam induced damage to the perfluorosulfonic acid (PFSA) ionomer is quantified by following the fluorine mass loss with electron exposure and is then mitigated by a few orders of magnitude using cryogenic specimen cooling and a higher incident electron voltage. Multivariate statistical analysis is also applied to the analysis of spectrum images for data denoising and unbiased separation of independent components related to the catalyst, ionomer, and support.

  11. Scanning tunneling microscopy reveals LiMnAs is a room temperature anti-ferromagnetic semiconductor

    SciTech Connect (OSTI)

    Wijnheijmer, A. P.; Koenraad, P. M.; Marti, X.; Holy, V.; Cukr, M.; Novak, V.; Jungwirth, T.

    2012-03-12

    We performed scanning tunneling microscopy and spectroscopy on a LiMnAs(001) thin film epitaxially grown on an InAs(001) substrate by molecular beam epitaxy. While the in situ cleavage exposed only the InAs(110) non-polar planes, the cleavage continued into the LiMnAs thin layer across several facets. We combined both topography and current mappings to confirm that the facets correspond to LiMnAs. By spectroscopy we show that LiMnAs has a band gap. The band gap evidenced in this study, combined with the known Neel temperature well above room temperature, confirms that LiMnAs is a promising candidate for exploring the concepts of high temperature semiconductor spintronics based on antiferromagnets.

  12. Ultrasonic probe deployment device for increased wave transmission and rapid area scan inspections

    DOE Patents [OSTI]

    DiMambro, Joseph; Roach, Dennis P; Rackow, Kirk A; Nelson, Ciji L; Dasch, Cameron J; Moore, David G

    2013-02-12

    An ultrasonic probe deployment device in which an ultrasound-transmitting liquid forms the portion of the ultrasonic wave path in contact with the surface being inspected (i.e., the inspection surface). A seal constrains flow of the liquid, for example preventing the liquid from surging out and flooding the inspection surface. The seal is not rigid and conforms to variations in the shape and unevenness of the inspection surface, thus forming a seal (although possibly a leaky seal) around the liquid. The probe preferably is held in place to produce optimum ultrasonic focus on the area of interest. Use of encoders can facilitate the production of C-scan area maps of the material being inspected.

  13. Ultrasonic probe deployment device for increased wave transmission and rapid area scan inspections

    DOE Patents [OSTI]

    DiMambro, Joseph; Roach, Dennis P.; Rackow, Kirk A.; Nelson, Ciji L.; Dasch, Cameron J.; Moore, David G.

    2012-01-03

    An ultrasonic probe deployment device in which an ultrasound-transmitting liquid forms the portion of the ultrasonic wave path in contact with the surface being inspected (i.e., the inspection surface). A seal constrains flow of the liquid, for example preventing the liquid from surging out and flooding the inspection surface. The seal is not rigid and conforms to variations in the shape and unevenness of the inspection surface, thus forming a seal (although possibly a leaky seal) around the liquid. The probe preferably is held in place to produce optimum ultrasonic focus on the area of interest. Use of encoders can facilitate the production of C-scan area maps of the material being inspected.

  14. Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam F.; Jesse, Stephen; Belianinov, Alex; Somnath, Suhas; Rodriguez, Brian J.; Balke, Nina; Kalinin, Sergei V.

    2016-02-11

    Since its inception over two decades ago, Kelvin probe force microscopy (KPFM) has become the standard technique for characterizing electrostatic, electrochemical and electronic properties at the nanoscale. In this work, we present a purely digital, software-based approach to KPFM utilizing big data acquisition and analysis methods. General Mode (G-Mode) KPFM, works by capturing the entire photodetector data stream, typically at the sampling rate limit, followed by subsequent de-noising, analysis and compression of the cantilever response. We demonstrate that the G-Mode approach allows simultaneous multi-harmonic detection, combined with on-the-fly transfer function correction required for quantitative CPD mapping. The KPFM approach outlinedmore » in this work significantly simplifies the technique by avoiding cumbersome instrumentation optimization steps (i.e. lock in parameters, feedback gains etc.), while also retaining the flexibility to be implemented on any atomic force microscopy platform. We demonstrate the added advantages of G-Mode KPFM by allowing simultaneous mapping of CPD and capacitance gradient (C') channels as well as increased flexibility in data exploration across frequency, time, space, and noise domains. As a result, G-Mode KPFM is particularly suitable for characterizing voltage sensitive materials or for operation in conductive electrolytes, and will be useful for probing electrodynamics in photovoltaics, liquids and ionic conductors.« less

  15. Copper intercalation at the interface of graphene and Ir(111) studied by scanning tunneling microscopy

    SciTech Connect (OSTI)

    Sicot, M. Fagot-Revurat, Y.; Kierren, B.; Vasseur, G.; Malterre, D.

    2014-11-10

    We report on the intercalation of a submonolayer of copper at 775?K underneath graphene epitaxially grown on Ir(111) studied by means of low energy electron diffraction (LEED) and scanning tunneling microscopy (STM) at 77?K. Nucleation and growth dynamics of Cu below graphene have been investigated, and, most importantly, the intercalation mechanism has been identified. First, LEED patterns reveal the pseudomorphic growth of Cu on Ir under the topmost graphene layer resulting in a large Cu in-plane lattice parameter expansion of about 6% compared to Cu(111). Second, large-scale STM topographs as a function of Cu coverage show that Cu diffusion on Ir below graphene exhibits a low energy barrier resulting in Cu accumulation at Ir step edges. As a result, the graphene sheet undergoes a strong edges reshaping. Finally, atomically-resolved STM images reveal a damaged graphene sheet at the atomic scale after metal intercalation. Point defects in graphene were shown to be carbon vacancies. According to these results, a Cu penetration path beneath graphene is proposed to occur via metal aided defect formation with no or poor self healing of the graphene sheet. This work illustrates the fact that Cu intercalation is harmful for graphene grown on Ir(111) at the atomic scale.

  16. Applications of scanning electron microscopy to the study of mineral matter in peat

    SciTech Connect (OSTI)

    Raymond, R. Jr.; Andrejko, M.J.; Bardin, S.W.

    1983-01-01

    Scanning electron microscopy (SEM) and energy dispersive spectrometry (EDS) have been used for in situ analysis of minerals in peats by combining methods for producing oriented microtome sections of peat with methods for critical point drying. The combined technique allows SEM analysis of the inorganic components and their associated botanical constituents, along with petrographic identification of the botanical constituents. In peat deposits with abundant fluvial- or marine-derived minerals, one may use the above technique and/or medium- or low-temperature ashing followed by x-ray diffraction to readily identify the various mineral components. However, in some freshwater environments the scarcity of non-silica minerals makes the above techniques impractical. By separating the inorganic residues from the peat, one can isolate the non-silica mineral matter in the SEM for analysis by EDS. Furthermore, such separation allows SEM analysis of features and textures of both silica and non-silica mineral particles that might otherwise be unidentifiable. Results indicate the occurrence of detritial minerals in both Okefenokee and Snuggedy Swamp peats, the presence of authigenic or diagenetic minerals growing within peats, and dissolution features on freshwater sponge spicules that may account for the absence of spicules in Tertiary lignites.

  17. Unveiling Stability Criteria of DNA-Carbon Nanotubes Constructs by Scanning Tunneling Microscopy and Computational Modeling

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Kilina, Svetlana; Yarotski, Dzmitry A.; Talin, A. Alec; Tretiak, Sergei; Taylor, Antoinette J.; Balatsky, Alexander V.

    2011-01-01

    We present a combined approach that relies on computational simulations and scanning tunneling microscopy (STM) measurements to reveal morphological properties and stability criteria of carbon nanotube-DNA (CNT-DNA) constructs. Application of STM allows direct observation of very stable CNT-DNA hybrid structures with the well-defined DNA wrapping angle of 63.4 ° and a coiling period of 3.3 nm. Using force field simulations, we determine how the DNA-CNT binding energy depends on the sequence and binding geometry of a single strand DNA. This dependence allows us to quantitatively characterize the stability of a hybrid structure with an optimal π-stacking between DNA nucleotides andmore » the tube surface and better interpret STM data. Our simulations clearly demonstrate the existence of a very stable DNA binding geometry for (6,5) CNT as evidenced by the presence of a well-defined minimum in the binding energy as a function of an angle between DNA strand and the nanotube chiral vector. This novel approach demonstrates the feasibility of CNT-DNA geometry studies with subnanometer resolution and paves the way towards complete characterization of the structural and electronic properties of drug-delivering systems based on DNA-CNT hybrids as a function of DNA sequence and a nanotube chirality.« less

  18. Atomic-scale electrochemistry on the surface of a manganite by scanning tunneling microscopy

    SciTech Connect (OSTI)

    Vasudevan, Rama K. Tselev, Alexander; Baddorf, Arthur P.; Gianfrancesco, Anthony G.

    2015-04-06

    The doped manganese oxides (manganites) have been widely studied for their colossal magnetoresistive effects, for potential applications in oxide spintronics, electroforming in resistive switching devices, and are materials of choice as cathodes in modern solid oxide fuel cells. However, little experimental knowledge of the dynamics of the surfaces of perovskite manganites at the atomic scale exists. Here, through in-situ scanning tunneling microscopy (STM), we demonstrate atomic resolution on samples of La{sub 0.625}Ca{sub 0.375}MnO{sub 3} grown on (001) SrTiO{sub 3} by pulsed laser deposition. Furthermore, by applying triangular DC waveforms of increasing amplitude to the STM tip, and measuring the tunneling current, we demonstrate the ability to both perform and monitor surface electrochemical processes at the atomic level, including formation of oxygen vacancies and removal and deposition of individual atomic units or clusters. Our work paves the way for better understanding of surface oxygen reactions in these systems.

  19. SCANNING ELECTRON MICROSCOPY AND X-RAY DIFFRACTION ANALYSIS OF TANK 18 SAMPLES

    SciTech Connect (OSTI)

    Hay, M.; O'Rourke, P.; Ajo, H.

    2012-03-08

    The F-Area Tank Farm (FTF) Performance Assessment (PA) utilizes waste speciation in the waste release model used in the FTF fate and transport modeling. The waste release modeling associated with the residual plutonium in Tank 18 has been identified as a primary contributor to the Tank 18 dose uncertainty. In order to reduce the uncertainty related to plutonium in Tank 18, a better understanding of the plutonium speciation in the Tank 18 waste (including the oxidation state and stoichiometry) is desired. Savannah River National Laboratory (SRNL) utilized Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to analyze Tank 18 samples to provide information on the speciation of plutonium in the waste material. XRD analysis of the Tank 18 samples did not identify any plutonium mineral phases in the samples. These indicates the crystalline mineral phases of plutonium are below the detection limits of the XRD method or that the plutonium phase(s) lack long range order and are present as amorphous or microcrystalline solids. SEM analysis of the Tank 18 samples did locate particles containing plutonium. The plutonium was found as small particles, usually <1 {micro}m but ranging up to several micrometers in diameter, associated with particles of an iron matrix and at low concentration in other elemental matrices. This suggests the plutonium has an affinity for the iron matrix. Qualitatively, the particles of plutonium found in the SEM analysis do not appear to account for all of the plutonium in the sample based on concentrations determined from the chemical analysis of the Tank 18 samples. This suggests that plutonium is also distributed throughout the solids in low concentrations.

  20. Electron and Scanning Probe Microscopies | U.S. DOE Office of...

    Office of Science (SC) Website

    of nanostructured materials for hydrogen storage and solar hydrogen generation. ... to the Basic Energy Science's organization chart .pdf file (47KB) and budget request. ...

  1. SCAN+

    Energy Science and Technology Software Center (OSTI)

    2009-11-01

    SCAN+ is a software application specifically designed to control the positioning of a gamma spectrometer by a two dimensional translation system above spent fuel bundles located in a sealed spent fuel cask. The gamma spectrometer collects gamma spectrum information for the purpose of spent fuel cask fuel loading verification. SCAN+ performs manual and automatic gamma spectrometer positioning functions as-well-as exercising control of the gamma spectrometer data acquisitioning functions. Cask configuration files are used to determinemore » the positions of spent fuel bundles. Cask scanning files are used to determine the desired scan paths for scanning a spent fuel cask allowing for automatic unattended cask scanning that may take several hours.« less

  2. SCAN+

    Energy Science and Technology Software Center (OSTI)

    2009-11-01

    SCAN+ is a software application specifically designed to control the positioning of a gamma spectrometer by a two dimensional translation system above spent fuel bundles located in a sealed spent fuel cask. The gamma spectrometer collects gamma spectrum information for the purpose of spent fuel cask fuel loading verification. SCAN+ performs manual and automatic gamma spectrometer positioning functions as-well-as exercising control of the gamma spectrometer data acquisitioning functions. Cask configuration files are used to determinemorethe positions of spent fuel bundles. Cask scanning files are used to determine the desired scan paths for scanning a spent fuel cask allowing for automatic unattended cask scanning that may take several hours.less

  3. A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization

    SciTech Connect (OSTI)

    Berger, Andrew J. Page, Michael R.; Young, Justin R.; Bhallamudi, Vidya P.; Johnston-Halperin, Ezekiel; Pelekhov, Denis V.; Hammel, P. Chris; Jacob, Jan; Lewis, Jim; Wenzel, Lothar

    2014-12-15

    Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

  4. Imaging thermal conductivity with nanoscale resolution using a scanning spin probe

    SciTech Connect (OSTI)

    Laraoui, Abdelghani; Aycock-Rizzo, Halley; Gao, Yang; Lu, Xi; Riedo, Elisa; Meriles, Carlos A.

    2015-11-20

    The ability to probe nanoscale heat flow in a material is often limited by lack of spatial resolution. Here, we use a diamond-nanocrystal-hosted nitrogen-vacancy centre attached to the apex of a silicon thermal tip as a local temperature sensor. We apply an electrical current to heat up the tip and rely on the nitrogen vacancy to monitor the thermal changes the tip experiences as it is brought into contact with surfaces of varying thermal conductivity. By combining atomic force and confocal microscopy, we image phantom microstructures with nanoscale resolution, and attain excellent agreement between the thermal conductivity and topographic maps. The small mass and high thermal conductivity of the diamond host make the time response of our technique short, which we demonstrate by monitoring the tip temperature upon application of a heat pulse. Our approach promises multiple applications, from the investigation of phonon dynamics in nanostructures to the characterization of heterogeneous phase transitions and chemical reactions in various solid-state systems.

  5. Imaging thermal conductivity with nanoscale resolution using a scanning spin probe

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Laraoui, Abdelghani; Aycock-Rizzo, Halley; Gao, Yang; Lu, Xi; Riedo, Elisa; Meriles, Carlos A.

    2015-11-20

    The ability to probe nanoscale heat flow in a material is often limited by lack of spatial resolution. Here, we use a diamond-nanocrystal-hosted nitrogen-vacancy centre attached to the apex of a silicon thermal tip as a local temperature sensor. We apply an electrical current to heat up the tip and rely on the nitrogen vacancy to monitor the thermal changes the tip experiences as it is brought into contact with surfaces of varying thermal conductivity. By combining atomic force and confocal microscopy, we image phantom microstructures with nanoscale resolution, and attain excellent agreement between the thermal conductivity and topographic maps.more » The small mass and high thermal conductivity of the diamond host make the time response of our technique short, which we demonstrate by monitoring the tip temperature upon application of a heat pulse. Our approach promises multiple applications, from the investigation of phonon dynamics in nanostructures to the characterization of heterogeneous phase transitions and chemical reactions in various solid-state systems.« less

  6. Understanding S-shaped current-voltage characteristics of organic solar cells: Direct measurement of potential distributions by scanning Kelvin probe

    SciTech Connect (OSTI)

    Saive, Rebecca Kowalsky, Wolfgang; Institut fr Hochfrequenztechnik, TU Braunschweig, 38106 Braunschweig; Kirchhoff-Institute for Physics, Heidelberg University, 69120 Heidelberg ; Mueller, Christian; Kirchhoff-Institute for Physics, Heidelberg University, 69120 Heidelberg ; Schinke, Janusz; Lovrincic, Robert; Institut fr Hochfrequenztechnik, TU Braunschweig, 38106 Braunschweig

    2013-12-09

    We present a comparison of the potential distribution along the cross section of bilayer poly(3-hexylthiophene)/1-(3-methoxycarbonyl)propyl-1-phenyl[6,6]C61 (P3HT/PCBM) solar cells, which show normal and anomalous, S-shaped current-voltage (IV) characteristics. We expose the cross sections of the devices with a focussed ion beam and measure them with scanning Kelvin probe microscopy. We find that in the case of S-shaped IV-characteristics, there is a huge potential drop at the PCBM/Al top contact, which does not occur in solar cells with normal IV-characteristics. This behavior confirms the assumption that S-shaped curves are caused by hindered charge transport at interfaces.

  7. Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy

    DOE Patents [OSTI]

    Rose, Volker; Preissner, Curt A; Hla, Saw-Wai; Wang, Kangkang; Rosenmann, Daniel

    2014-09-30

    A method and system for performing simultaneous topographic and elemental chemical and magnetic contrast analysis in a scanning, tunneling microscope. The method and system also includes nanofabricated coaxial multilayer tips with a nanoscale conducting apex and a programmable in-situ nanomanipulator to fabricate these tips and also to rotate tips controllably.

  8. NREL: Measurements and Characterization - Analytical Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Analytical Microscopy Analytical microscopy uses various high-resolution techniques to obtain information about materials on the atomic scale. It is one of the most powerful tools available for understanding a material's basic structure, chemistry, and morphology. We use two complementary types of analytical microscopy - electron microscopy and scanning probe microscopy - together with a variety of state-of-the-art imaging and analytical tools to capture data about photovoltaic (PV) materials

  9. Determination of pigments in colour layers on walls of some selected historical buildings using optical and scanning electron microscopy

    SciTech Connect (OSTI)

    Skapin, A. Sever Ropret, P. Bukovec, P.

    2007-11-15

    For successful restoration of painted walls and painted coloured finishing coats it is necessary to determine the composition of the original colour layers. Identification of the pigments used in The Cistercian Abbey of Sticna and The Manor of Novo Celje was carried out using optical and scanning electron microscopy. Selected samples of wall paintings were inspected by the combined application of an optical microscope and a low-vacuum Scanning Electron Microscope to determine their colour and structural features and to identify the position of individual pigment grains. Energy dispersive spectroscopy was used to determine the elemental distribution on selected surfaces and elemental composition of individual pigments. It was found that the most abundantly used pigments were iron oxide red, cinnabar, green earth, umber, calcium carbonate white, ultramarine, yellow ochre and carbon black. These identifications have allowed us to compare the use of various pigments in buildings from different historical periods.

  10. Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy

    DOE Patents [OSTI]

    Kazmerski, Lawrence L. (Lakewood, CO)

    1990-01-01

    A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

  11. Understanding Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic Resolution Electron Microscopy and Field Evaporation Simulation

    SciTech Connect (OSTI)

    Devaraj, Arun; Colby, Robert J.; Vurpillot, F.; Thevuthasan, Suntharampillai

    2014-03-26

    Metal-dielectric composite materials, specifically metal nanoparticles supported on or embedded in metal oxides, are widely used in catalysis. The accurate optimization of such nanostructures warrants the need for detailed three-dimensional characterization. Atom probe tomography is uniquely capable of generating sub-nanometer structural and compositional data with part-per-million mass sensitivity, but there are reconstruction artifacts for composites containing materials with strongly differing fields of evaporation, as for oxide-supported metal nanoparticles. By correlating atom probe tomography with scanning transmission electron microscopy for Au nanoparticles embedded in an MgO support, deviations from an ideal topography during evaporation are demonstrated directly, and correlated with compositional errors in the reconstructed data. Finite element simulations of the field evaporation process confirm that protruding Au nanoparticles will evolve on the tip surface, and that evaporation field variations lead to an inaccurate assessment of the local composition, effectively lowering the spatial resolution of the final reconstructed dataset. Cross-correlating the experimental data with simulations results in a more detailed understanding of local evaporation aberrations during APT analysis of metal-oxide composites, paving the way towards a more accurate three-dimensional characterization of this technologically important class of materials.

  12. Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy

    SciTech Connect (OSTI)

    Sutter, P. Sutter, E.

    2014-09-01

    We assess scanning electron microscopy (SEM) and Auger electron spectroscopy (AES) for thickness measurements on few-layer hexagonal boron nitride (h-BN), the layered dielectric of choice for integration with graphene and other two-dimensional materials. Observations on h-BN islands with large, atomically flat terraces show that the secondary electron intensity in SEM reflects monolayer height changes in films up to least 10 atomic layers thickness. From a quantitative analysis of AES data, the energy-dependent electron escape depth in h-BN films is deduced. The results show that AES is suitable for absolute thickness measurements of few-layer h-BN of 1 to 6 layers.

  13. Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ioni Beam-scanning Electron Microscopy

    SciTech Connect (OSTI)

    G Nelson; W Harris; J Lombardo; J Izzo Jr.; W Chiu; P Tanasini; M Cantoni; J Van herle; C Comninellis; et al.

    2011-12-31

    X-ray nanotomography and focused ion beam scanning electron microscopy (FIB-SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIB-SEM enable elemental mapping within the microstructure. Using these methods, non-destructive 3D x-ray imaging and FIB-SEM serial sectioning have been applied to compare three-dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

  14. Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ion Beam - Scanning Electron Microscopy

    SciTech Connect (OSTI)

    Nelson, George J.; Harris, William H.; Lombardo, Jeffrey J.; Izzo, Jr., John R.; Chiu, W. K. S.; Tanasini, Pietro; Cantoni, Marco; Van herle, Jan; Comninellis, Christos; Andrews, Joy C.; Liu, Yijin; Pianetta, Piero; Chu, Yong

    2011-03-24

    X-ray nanotomography and focused ion beam scanning electron microscopy (FIB-SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIBSEM enable elemental mapping within the microstructure. Using these methods, non-destructive 3D x-ray imaging and FIBSEM serial sectioning have been applied to compare three-dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

  15. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images

    SciTech Connect (OSTI)

    Gonnissen, J.; De Backer, A.; Martinez, G. T.; Van Aert, S.; Dekker, A. J. den; Rosenauer, A.; Sijbers, J.

    2014-08-11

    We report an innovative method to explore the optimal experimental settings to detect light atoms from scanning transmission electron microscopy (STEM) images. Since light elements play a key role in many technologically important materials, such as lithium-battery devices or hydrogen storage applications, much effort has been made to optimize the STEM technique in order to detect light elements. Therefore, classical performance criteria, such as contrast or signal-to-noise ratio, are often discussed hereby aiming at improvements of the direct visual interpretability. However, when images are interpreted quantitatively, one needs an alternative criterion, which we derive based on statistical detection theory. Using realistic simulations of technologically important materials, we demonstrate the benefits of the proposed method and compare the results with existing approaches.

  16. A 4 K cryogenic probe for use in magnetic resonance force microscopy experiments

    SciTech Connect (OSTI)

    Smith, Doran D.; Alexson, Dimitri A. [U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, Maryland 20783 (United States)] [U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, Maryland 20783 (United States); Garbini, Joseph L. [Mechanical Engineering, University of Washington, Seattle, Washington 98195 (United States)] [Mechanical Engineering, University of Washington, Seattle, Washington 98195 (United States)

    2013-09-15

    The detailed design of a mechanically detected nuclear magnetic resonance probe using the SPAM (Springiness Preservation by Aligning Magnetization) geometry, operating at 4 K, in vacuum, and a several-Tesla magnetic field is described. The probe head is vibration-isolated well enough from the environment by a three-spring suspension system that the cantilever achieves thermal equilibrium with the environment without the aid of eddy current damping. The probe uses an ultra-soft Si cantilever with a Ni sphere attached to its tip, and magnetic resonance is registered as a change in the resonant frequency of the driven cantilever. The RF system uses frequency sweeps for adiabatic rapid passage using a 500 ?m diameter RF coil wound around a sapphire rod. The RF coil and optical fiber of the interferometer used to sense the cantilever's position are both located with respect to the cantilever using a Garbini micropositioner, and the sample stage is mounted on an Attocube nanopositioner.

  17. Nanoscale magnetic field mapping with a single spin scanning probe magnetometer

    SciTech Connect (OSTI)

    Rondin, L.; Tetienne, J.-P.; Spinicelli, P.; Roch, J.-F.; Jacques, V.; Dal Savio, C.; Karrai, K.; Dantelle, G.; Thiaville, A.; Rohart, S.

    2012-04-09

    We demonstrate quantitative magnetic field mapping with nanoscale resolution, by applying a lock-in technique on the electron spin resonance frequency of a single nitrogen-vacancy defect placed at the apex of an atomic force microscope tip. In addition, we report an all-optical magnetic imaging technique which is sensitive to large off-axis magnetic fields, thus extending the operation range of diamond-based magnetometry. Both techniques are illustrated by using a magnetic hard disk as a test sample. Owing to the non-perturbing and quantitative nature of the magnetic probe, this work should open up numerous perspectives in nanomagnetism and spintronics.

  18. Imaging individual lanthanum atoms in zeolite Y by scanning transmission electron microscopy: evidence of lanthanum pair sites

    SciTech Connect (OSTI)

    Xu, Pinghong; Lu, Jing; Aydin, C.; Debefve, Louise M.; Browning, Nigel D.; Chen, Cong-Yan; Gates, Bruce C.

    2015-09-01

    Images of La-exchanged NaY zeolite obtained with aberration-corrected scanning transmission electron microscopy (STEM) show that about 80% of the La cations were present as site-isolated species, with the remainder in pair sites. The distance between La cations in the pair sites ranged from 1.44 to 3.84 , consistent with the presence of pairs of cations tilted at various angles with respect to the support surface. The actual distance between La cations in the pair sites is inferred to be approximately 3.84 , which is shorter than the distance between the nearest Al sites in the zeolite (4.31 ). The results therefore suggest the presence of dimeric structures of La cations bridged with OH groups, and the presence of such species has been inferred previously on the basis of X-ray photoelectron spectroscopy (W. Grnert, U. Sauerlandt, R. Schlgl, H.G. Karge, J. Phys. Chem., 97 (1993) 1413).

  19. Atomic-resolution study of polarity reversal in GaSb grown on Si by scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Hosseini Vajargah, S.; Woo, S. Y.; Botton, G. A.; Ghanad-Tavakoli, S.; Kleiman, R. N.; Preston, J. S.

    2012-11-01

    The atomic-resolved reversal of the polarity across an antiphase boundary (APB) was observed in GaSb films grown on Si by high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The investigation of the interface structure at the origin of the APB reveals that coalescence of two domains with Ga-prelayer and Sb-prelayer causes the sublattice reversal. The local strain and lattice rotation distributions of the APB, attributed to the discordant bonding length at the APB with the surrounding GaSb lattice, were further studied using the geometric phase analysis technique. The crystallographic characteristics of the APBs and their interaction with other planar defects were observed with HAADF-STEM. The quantitative agreement between experimental and simulated images confirms the observed polarities in the acquired HAADF-STEM data. The self-annihilation mechanism of the APBs is addressed based on the rotation induced by anti-site bonds and APBs' faceting.

  20. Controlled-Resonant Surface Tapping-Mode Scanning Probe Electrospray Ionization Mass Spectrometry Imaging

    SciTech Connect (OSTI)

    Lorenz, Matthias; Ovchinnikova, Olga S; Kertesz, Vilmos; Van Berkel, Gary J

    2014-01-01

    This paper reports on the advancement of a controlled-resonance surface tapping-mode single capillary liquid junction extraction/ESI emitter for mass spectrometry imaging. The basic instrumental setup and the general operation of the system were discussed and optimized performance metrics were presented. The ability to spot sample, lane scan and chemically image in an automated and controlled fashion were demonstrated. Rapid, automated spot sampling was demonstrated for a variety of compound types including the cationic dye basic blue 7, the oligosaccharide cellopentaose, and the protein equine heart cytochrome c. The system was used for lane scanning and chemical imaging of the cationic dye crystal violet in inked lines on glass and for lipid distributions in mouse brain thin tissue sections. Imaging of the lipids in mouse brain tissue under optimized conditions provided a spatial resolution of approximately 35 m based on the ability to distinguish between features observed both in the optical and mass spectral chemical images. The sampling spatial resolution of this system was comparable to the best resolution that has been reported for other types of atmospheric pressure liquid extraction-based surface sampling/ionization techniques used for mass spectrometry imaging.

  1. Charge transfer of single laser crystallized intrinsic and phosphorus-doped Si-nanocrystals visualized by Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Xu, Jie; Xu, Jun Lu, Peng; Shan, Dan; Li, Wei; Chen, Kunji

    2014-10-07

    Isolated intrinsic and phosphorus doped (P-doped) Si-nanocrystals (Si-NCs) on n- and p-Si substrates are fabricated by excimer laser crystallization techniques. The formation of Si-NCs is confirmed by atomic force microscopy (AFM) and conductive AFM measurements. Kelvin probe force microscopy (KPFM) is then carried out to visualize the trapped charges in a single Si-NC dot which derives from the charge transfer between Si-NCs and Si substrates due to their different Fermi levels. The laser crystallized P-doped Si-NCs have a similar Fermi level around the mid-gap to the intrinsic counterparts, which might be caused by the inactivated impurity atoms or the surface states-related Fermi level pinning. A clear rise of the Fermi level in P-doped Si-NCs is observed after a short time thermal annealing treatment, indicating the activation of dopants in Si-NCs. Moreover, the surface charge quantity can be estimated using a simple parallel plate capacitor model for a quantitative understanding of the KPFM results at the nanoscale.

  2. Directly correlated transmission electron microscopy and atom probe tomography of grain boundary oxidation in a Ni-Al binary alloy exposed to high-temperature water.

    SciTech Connect (OSTI)

    Schreiber, Daniel K.; Olszta, Matthew J.; Bruemmer, Stephen M.

    2013-10-30

    Intergranular oxidation of a Ni-4Al alloy exposed to hydrogenated, high-temperature water was characterized using directly correlated transmission electron microscopy and atom probe tomography. These combined analyses revealed that discrete, well-separated oxides (NiAl2O4) precipitated along grain boundaries in the metal. Aluminum was depleted from the grain boundary between oxides and also from one side of the boundary as a result of grain boundary migration. The discrete oxide morphology, disconnected from the continuous surface oxidation, suggests intergranular solid-state internal oxidation of Al. Keywords: oxidation; grain boundaries; nickel alloys; atom probe tomography; transmission electron microscopy (TEM)

  3. Scanning Tunneling Microscopy and Theoretical Study of Water Adsorption on Fe3O4: Implications for Catalysis

    SciTech Connect (OSTI)

    Rim, Kwang T.; Eom, Daejin; Chan, Siu-Wai; Flytzani-Stephanopoulos, Maria; Flynn, George; Wen, Xiaodong; Batista, Enrique R.

    2012-10-23

    The reduced surface of a natural Hematite single crystal a-Fe2O3(0001) sample has multiple surface domains with di!erent terminations, Fe2O3(0001), FeO(111), and Fe3O4(111). The adsorption of water on this surface was investigated via Scanning Tunneling Microscopy (STM) and first-principle theoretical simulations. Water species are observed only on the Fe-terminated Fe3O4(111) surface at temperatures up to 235 K. Between 235 and 245 K we observed a change in the surface species from intact water molecules and hydroxyl groups bound to the surface to only hydroxyl groups atop the surface terminating FeIII cations. This indicates a low energy barrier for water dissociation on the surface of Fe3O4 that is supported by our theoretical computations. Our first principles simulations con"rm the identity of the surface species proposed from the STM images, finding that the most stable state of a water molecule is the dissociated one (OH + H), with OH atop surface terminating FeIII sites and H atop under-coordinated oxygen sites. Attempts to simulate reaction of the surface OH with coadsorbed CO fail because the only binding sites for CO are the surface FeIII atoms, which are blocked by the much more strongly bound OH. In order to promote this reaction we simulated a surface decorated with gold atoms. The Au adatoms are found to cap the under-coordinated oxygen sites and dosed CO is found to bind to the Au adatom. This newly created binding site for CO not only allows for coexistence of CO and OH on the surface of Fe3O4 but also provides colocation between the two species. These two factors are likely promoters of catalytic activity on Au/Fe3O4(111) surfaces.

  4. Characterization of one-dimensional molecular chains of 4,4'-biphenyl diisocyanide on Au(111) by scanning tunneling microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhou, Jing; Li, Yan; Zahl, Percy; Sutter, Peter; Stacchiola, Dario J.; White, Michael G.

    2015-03-14

    The morphology and electronic structure of vapor deposited 4,4'-biphenyldiisocyanide (BPDI) on a Au(111) surface were investigated using variable-temperature scanning tunneling microscopy (STM). When deposited at room temperature, BPDI molecules form one-dimensional molecular chains similar to that recently observed for the structurally related 1,4-phenyl diisocyanide (PDI). Compared to PDI, the longer periodicity for the BPDI molecular chains is consistent with the addition of a second phenyl ring and supports a structural model in which the BPDI molecules lie parallel to the surface and interconnected by Au-adatoms. The molecular chains are mostly aligned along the [110] direction of the Au(111) substrate, butmore » exhibit frequent changes in angle that are consistent with directions between fcc and hcp three-fold hollow sites. Dispersion-corrected density functional theory calculations for one-dimensional chains of BPDI molecules bound end-to-end via their isocyanide groups to Au-adatoms reproduce the observed periodicity of the chains and show that this morphology is energetically favored over upright binding with one free –NC group. The spatially resolved conductance (dI/dV) map for BPDI on Au(111) exhibits a feature centered at -0.67 eV below the Fermi level which are delocalized along the chain with maxima at the Au-adatom and biphenyl positions. This occupied resonant feature is close to that previously observed for the PDI in both photoemission and conductance measurements and is attributed to an occupied interfacial state resulting from BPDI-Au interactions« less

  5. Scanning ultrasonic probe

    DOE Patents [OSTI]

    Kupperman, David S. (Oak Park, IL); Reimann, Karl J. (Lisle, IL)

    1982-01-01

    The invention is an ultrasonic testing device for rapid and complete examination of the test specimen, and is particularly well suited for evaluation of tubular test geometries. A variety of defect categories may be detected and analyzed at one time and their positions accurately located in a single pass down the test specimen.

  6. Scanning ultrasonic probe

    DOE Patents [OSTI]

    Kupperman, D.S.; Reimann, K.J.

    1980-12-09

    The invention is an ultrasonic testing device for rapid and complete examination of the test specimen, and is particularly well suited for evaluation of tubular test geometries. A variety of defect categories may be detected and anlayzed at one time and their positions accurately located in a single pass down the test specimen.

  7. Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy

    DOE Patents [OSTI]

    Fang, Ning; Sun, Wei

    2015-04-21

    A method, apparatus, and system for improved VA-TIRFM microscopy. The method comprises automatically controlled calibration of one or more laser sources by precise control of presentation of each laser relative a sample for small incremental changes of incident angle over a range of critical TIR angles. The calibration then allows precise scanning of the sample for any of those calibrated angles for higher and more accurate resolution, and better reconstruction of the scans for super resolution reconstruction of the sample. Optionally the system can be controlled for incident angles of the excitation laser at sub-critical angles for pseudo TIRFM. Optionally both above-critical angle and sub critical angle measurements can be accomplished with the same system.

  8. Scanned Copy

    Office of Environmental Management (EM)

    Scanned Copy

  9. Classification of Multiple Types of Organic Carbon Composition in Atmospheric Particles by Scanning Transmission X-Ray Microscopy Analysis

    SciTech Connect (OSTI)

    Kilcoyne, Arthur L; Takahama, S.; Gilardoni, S.; Russell, L.M.; Kilcoyne, A.L.D.

    2007-05-16

    A scanning transmission X-ray microscope at the Lawrence Berkeley National Laboratory is used to measure organic functional group abundance and morphology of atmospheric aerosols. We present a summary of spectra, sizes, and shapes observed in 595 particles that were collected and analyzed between 2000 and 2006. These particles ranged between 0.1 and 12 mm and represent aerosols found in a large range of geographical areas, altitudes, and times. They include samples from seven different field campaigns: PELTI, ACE-ASIA, DYCOMS II, Princeton, MILAGRO (urban), MILAGRO (C-130), and INTEX-B. At least 14 different classes of organic particles show different types of spectroscopic signatures. Different particle types are found within the same region while the same particle types are also found in different geographical domains. Particles chemically resembling black carbon, humic-like aerosols, pine ultisol, and secondary or processed aerosol have been identified from functional group abundance and comparison of spectra with those published in the literature.

  10. Facility for low-temperature spin-polarized-scanning tunneling microscopy studies of magnetic/spintronic materials prepared in situ by nitride molecular beam epitaxy

    SciTech Connect (OSTI)

    Lin, Wenzhi; Foley, Andrew; Alam, Khan; Wang, Kangkang; Liu, Yinghao; Chen, Tianjiao; Pak, Jeongihm; Smith, Arthur R.

    2014-04-15

    Based on the interest in, as well as exciting outlook for, nitride semiconductor based structures with regard to electronic, optoelectronic, and spintronic applications, it is compelling to investigate these systems using the powerful technique of spin-polarized scanning tunneling microscopy (STM), a technique capable of achieving magnetic resolution down to the atomic scale. However, the delicate surfaces of these materials are easily corrupted by in-air transfers, making it unfeasible to study them in stand-alone ultra-high vacuum STM facilities. Therefore, we have carried out the development of a hybrid system including a nitrogen plasma assisted molecular beam epitaxy/pulsed laser epitaxy facility for sample growth combined with a low-temperature, spin-polarized scanning tunneling microscope system. The custom-designed molecular beam epitaxy growth system supports up to eight sources, including up to seven effusion cells plus a radio frequency nitrogen plasma source, for epitaxially growing a variety of materials, such as nitride semiconductors, magnetic materials, and their hetero-structures, and also incorporating in situ reflection high energy electron diffraction. The growth system also enables integration of pulsed laser epitaxy. The STM unit has a modular design, consisting of an upper body and a lower body. The upper body contains the coarse approach mechanism and the scanner unit, while the lower body accepts molecular beam epitaxy grown samples using compression springs and sample skis. The design of the system employs two stages of vibration isolation as well as a layer of acoustic noise isolation in order to reduce noise during STM measurements. This isolation allows the system to effectively acquire STM data in a typical lab space, which during its construction had no special and highly costly elements included, (such as isolated slabs) which would lower the environmental noise. The design further enables tip exchange and tip coating without breaking vacuum, and convenient visual access to the sample and tip inside a superconducting magnet cryostat. A sample/tip handling system is optimized for both the molecular beam epitaxy growth system and the scanning tunneling microscope system. The sample/tip handing system enables in situ STM studies on epitaxially grown samples, and tip exchange in the superconducting magnet cryostat. The hybrid molecular beam epitaxy and low temperature scanning tunneling microscopy system is capable of growing semiconductor-based hetero-structures with controlled accuracy down to a single atomic-layer and imaging them down to atomic resolution.

  11. Double capping of molecular beam epitaxy grown InAs/InP quantum dots studied by cross-sectional scanning tunneling microscopy

    SciTech Connect (OSTI)

    Ulloa, J. M.; Koenraad, P. M.; Gapihan, E.; Letoublon, A.; Bertru, N.

    2007-08-13

    Cross-sectional scanning tunneling microscopy was used to study at the atomic scale the double capping process of self-assembled InAs/InP quantum dots (QDs) grown by molecular beam epitaxy on a (311)B substrate. The thickness of the first capping layer is found to play a mayor role in determining the final results of the process. For first capping layers up to 3.5 nm, the height of the QDs correspond to the thickness of the first capping layer. Nevertheless, for thicknesses higher than 3.5 nm, a reduction in the dot height compared to the thickness of the first capping layer is observed. These results are interpreted in terms of a transition from a double capping to a classical capping process when the first capping layer is thick enough to completely cover the dots.

  12. Probing the elastic response of microalga Scenedesmus dimorphus in dry and aqueous environments through atomic force microscopy

    SciTech Connect (OSTI)

    Warren, K. M.; Mpagazehe, J. N.; Higgs, C. F. E-mail: higgs@andrew.cmu.edu; LeDuc, P. R. E-mail: higgs@andrew.cmu.edu

    2014-10-20

    With the re-emergence of microalgae as a replacement feedstock for petroleum-derived oils, researchers are working to understand its chemical and mechanical behavior. In this work, the mechanical properties of microalgae, Scenedesmus dimorphus, were investigated at the subcellular level to determine the elastic response of cells that were in an aqueous and dried state using nano-scale indentation through atomic force microscopy. The elastic modulus of single-celled S. dimorphus cells increased over tenfold from an aqueous state to a dried state, which allows us to better understand the biophysical response of microalgae to stress.

  13. Remote optical sensing on the nanometer scale with a bowtie aperture nano-antenna on a fiber tip of scanning near-field optical microscopy

    SciTech Connect (OSTI)

    Atie, Elie M.; Xie, Zhihua; El Eter, Ali; Salut, Roland; Baida, Fadi I.; Grosjean, Thierry; Nedeljkovic, Dusan; Tannous, Tony

    2015-04-13

    Plasmonic nano-antennas have proven the outstanding ability of sensing chemical and physical processes down to the nanometer scale. Sensing is usually achieved within the highly confined optical fields generated resonantly by the nano-antennas, i.e., in contact to the nanostructures. In this paper, we demonstrate the sensing capability of nano-antennas to their larger scale environment, well beyond their plasmonic confinement volume, leading to the concept of remote (non contact) sensing on the nanometer scale. On the basis of a bowtie-aperture nano-antenna (BNA) integrated at the apex of a SNOM (Scanning Near-field Optical Microscopy) fiber tip, we introduce an ultra-compact, moveable, and background-free optical nanosensor for the remote sensing of a silicon surface (up to distance of 300?nm). Sensitivity of the BNA to its large scale environment is high enough to expect the monitoring and control of the spacing between the nano-antenna and a silicon surface with sub-nanometer accuracy. This work paves the way towards an alternative class of nanopositioning techniques, based on the monitoring of diffraction-free plasmon resonance, that are alternative to nanomechanical and diffraction-limited optical interference-based devices.

  14. In Situ Observation of Water Dissociation with Lattice Incorporation at FeO Particle Edges Using Scanning Tunneling Microscopy and X-ray Photoelectron Spectroscopy

    SciTech Connect (OSTI)

    Deng, Xingyi; Lee, Junseok; Wang, Congjun; Matranga, Christopher; Aksoy, Funda; Liu, Zhi

    2011-03-15

    The dissociation of H2O and formation of adsorbed hydroxyl groups, on FeO particles grown on Au(111) were identified with in situ,: X:ray photoelectron spectroscopy (XPS) at water pressures ranging from 3 x 10-8 to 0.1 Torr. The facile dissociation of H2O takes place at FeO particle edges, and it was successfully observed in situ With atomically resolved scanning tunneling microscopy (STM). The in situ STM studies show that adsorbed hydroxyl groups were formed exclusively along the edges of the FeO particles with the 0 atom becoming directly incorporated into the oxide crystalline lattice The STM results are consistent with coordinatively unsaturated ferrous (CUF) sites along the FeO particle edge causing the observed reactivity with H2O. Our results also directly illustrate how structural defects and under.-coordinated sites participate in chemical reactions.

  15. Analysis of passivated A-286 stainless steel surfaces for mass spectrometer inlet systems by Auger electron and X-ray photoelectron spectroscopy and scanning electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ajo, Henry; Blankenship, Donnie; Clark, Elliot

    2014-07-25

    In this study, various commercially available surface treatments are being explored for use on stainless steel components in mass spectrometer inlet systems. Type A-286 stainless steel coupons, approximately 12.5 mm in diameter and 3 mm thick, were passivated with one of five different surface treatments; an untreated coupon served as a control. The surface and near-surface microstructure and chemistry of the coupons were investigated using sputter depth profiling using Auger electron spectroscopy, x-ray photoelectron spectroscopy, and scanning electron microscopy (SEM). All the surface treatments studied appeared to change the surface morphology dramatically, as evidenced by lack of tool marks onmore » the treated samples in SEM images. In terms of the passivation treatment, Vendors A-D appeared to have oxide layers that were very similar in thickness to each other (0.7–0.9 nm thick), as well as to the untreated samples (the untreated sample oxide layers appeared to be somewhat larger). Vendor E’s silicon coating appears to be on the order of 200 nm thick.« less

  16. Scanning Electron Microscopy Analysis of Fuel/Matrix Interaction Layers in Highly-Irradiated UMo Dispersion Fuel Plates with Al and AlSi Alloy Matrices

    SciTech Connect (OSTI)

    Dennis D. Keiser, Jr.; Jan-Fong Jue; Brandon D. Miller; Jian Gan; Adam B. Robinson; Pavel Medvedev; James Madden; Dan Wachs; Mitch Meyer

    2014-04-01

    In order to investigate how the microstructure of fuel/matrix-interaction (FMI) layers change during irradiation, different U7Mo dispersion fuel plates have been irradiated to high fission density and then characterized using scanning electron microscopy (SEM). Specifially, samples from irradiated U7Mo dispersion fuel elements with pure Al, Al2Si and AA4043 (~4.5 wt.%Si) matrices were SEM characterized using polished samples and samples that were prepared with a focused ion beam (FIB). Features not observable for the polished samples could be captured in SEM images taken of the FIB samples. For the Al matrix sample, a relatively large FMI layer develops, with enrichment of Xe at the FMI layer/Al matrix interface and evidence of debonding. Overall, a significant penetration of Si from the FMI layer into the U7Mo fuel was observed for samples with Si in the Al matrix, which resulted in a change of the size (larger) and shape (round) of the fission-gas bubbles. Additionally, solid-fission-product phases were observed to nucleate and grow within these bubbles. These changes in the localized regions of the microstructure of the U7Mo may contribute to changes observed in the macroscopic swelling of fuel plates with AlSi matrices.

  17. The structures and dynamics of atomic and molecular adsorbates on metal surfaces by scanning tunneling microscopy and low energy electron diffraction

    SciTech Connect (OSTI)

    Yoon, Hyungsuk Alexander

    1996-12-01

    Studies of surface structure and dynamics of atoms and molecules on metal surfaces are presented. My research has focused on understanding the nature of adsorbate-adsorbate and adsorbate-substrate interactions through surface studies of coverage dependency and coadsorption using both scanning tunneling microscopy (STM) and low energy electron diffraction (LEED). The effect of adsorbate coverage on the surface structures of sulfur on Pt(111) and Rh(111) was examined. On Pt(111), sulfur forms p(2x2) at 0.25 ML of sulfur, which transforms into a more compressed ({radical}3x{radical}3)R30{degrees} at 0.33 ML. On both structures, it was found that sulfur adsorbs only in fcc sites. When the coverage of sulfur exceeds 0.33 ML, it formed more complex c({radical}3x7)rect structure with 3 sulfur atoms per unit cell. In this structure, two different adsorption sites for sulfur atoms were observed - two on fcc sites and one on hcp site within the unit cell.

  18. Analysis of passivated A-286 stainless steel surfaces for mass spectrometer inlet systems by Auger electron and X-ray photoelectron spectroscopy and scanning electron microscopy

    SciTech Connect (OSTI)

    Ajo, Henry; Blankenship, Donnie; Clark, Elliot

    2014-07-25

    In this study, various commercially available surface treatments are being explored for use on stainless steel components in mass spectrometer inlet systems. Type A-286 stainless steel coupons, approximately 12.5 mm in diameter and 3 mm thick, were passivated with one of five different surface treatments; an untreated coupon served as a control. The surface and near-surface microstructure and chemistry of the coupons were investigated using sputter depth profiling using Auger electron spectroscopy, x-ray photoelectron spectroscopy, and scanning electron microscopy (SEM). All the surface treatments studied appeared to change the surface morphology dramatically, as evidenced by lack of tool marks on the treated samples in SEM images. In terms of the passivation treatment, Vendors A-D appeared to have oxide layers that were very similar in thickness to each other (0.70.9 nm thick), as well as to the untreated samples (the untreated sample oxide layers appeared to be somewhat larger). Vendor Es silicon coating appears to be on the order of 200 nm thick.

  19. Direct comparison between X-ray nanotomography and scanning electron microscopy for the microstructure characterization of a solid oxide fuel cell anode

    SciTech Connect (OSTI)

    Quey, R.; Suhonen, H.; Laurencin, J.; Cloetens, P.; Bleuet, P.

    2013-04-15

    X-ray computed nanotomography (nano-CT) and scanning electron microscopy (SEM) have been applied to characterize the microstructure of a Solid Oxide Fuel Cell (SOFC) anode. A direct comparison between the results of both methods is conducted on the same region of the microstructure to assess the spatial resolution of the nano-CT microstructure, SEM being taken as a reference. A registration procedure is proposed to find out the position of the SEM image within the nano-CT volume. It involves a second SEM observation, which is taken along an orthogonal direction and gives an estimate reference SEM image position, which is then refined by an automated optimization procedure. This enables an unbiased comparison between the cell porosity morphologies provided by both methods. In the present experiment, nano-CT is shown to underestimate the number of pores smaller than 1 ?m and overestimate the size of the pores larger than 1.5 ?m. - Highlights: ? X-ray computed nanotomography (nano-CT) and SEM are used to characterize an SOFC anode. ? A methodology is proposed to compare the nano-CT and SEM data on the same region. ? The spatial resolution of the nano-CT data is assessed from that comparison.

  20. In-Situ Transmission Electron Microscopy Probing of Native Oxide and Artificial Layers on Silicon Nanoparticles for Lithium Ion Batteries

    SciTech Connect (OSTI)

    He, Yang; Piper, Daniela M.; Gu, Meng; Travis, Jonathan J.; George, Steven M.; Lee, Se-Hee; Genc, Arda; Pullan, Lee; Liu, Jun; Mao, Scott X.; Zhang, Jiguang; Ban, Chunmei; Wang, Chong M.

    2014-11-25

    Surface modification of silicon nanoparticle via molecular layer deposition (MLD) has been recently proved to be an effective way for dramatically enhancing the cyclic performance in lithium ion batteries. However, the fundamental mechanism as how this thin layer of coating function is not known, which is even complicated by the inevitable presence of native oxide of several nanometers on the silicon nanoparticle. Using in-situ TEM, we probed in detail the structural and chemical evolution of both uncoated and coated silicon particles upon cyclic lithiation/delithation. We discovered that upon initial lithiation, the native oxide layer converts to crystalline Li2O islands, which essentially increases the impedance on the particle, resulting in ineffective lithiation/delithiation, and therefore low coulombic efficiency. In contrast, the alucone MLD coated particles show extremely fast, thorough and highly reversible lithiation behaviors, which are clarified to be associated with the mechanical flexibility and fast Li+/e- conductivity of the alucone coating. Surprisingly, the alucone MLD coating process chemically changes the silicon surface, essentially removing the native oxide layer and therefore mitigates side reaction and detrimental effects of the native oxide. This study provides a vivid picture of how the MLD coating works to enhance the coulombic efficiency and preserve capacity and clarifies the role of the native oxide on silicon nanoparticles during cyclic lithiation and delithiation. More broadly, this work also demonstrated that the effect of the subtle chemical modification of the surface during the coating process may be of equal importance as the coating layer itself.

  1. On-the-fly scans for X-ray ptychography

    SciTech Connect (OSTI)

    Pelz, Philipp M.; Guizar-Sicairos, Manuel; Johnson, Ian; Holler, Mirko; Menzel, Andreas; Thibault, Pierre

    2014-12-22

    With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the scanning system is one of the bottlenecks for fast imaging. Here, we demonstrate that ptychographic on-the-fly scans, i.e., collecting diffraction patterns while the sample is scanned with constant velocity, can be modelled as a state mixture of the probing radiation and allow for reliable image recovery. Characteristics of the probe modes are discussed for various scan parameters, and the application to significantly reducing the scanning time is considered.

  2. Analytical Microscopy and Imaging Science | Materials Science | NREL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Analytical Microscopy and Imaging Science An image of interconnecting yellow and red particles NREL uses transmission/scanning electron and scanning probe techniques to measure the chemical, structural, morphological, electrical, interfacial, and luminescent properties on the nano to Angstrom scale. We investigate such properties in a wide range of photovoltaic and semiconducting materials, with particular emphasis on extended defects and interfaces and how these affect device performance. A

  3. Potassium-induced effect on structure and chemical activity of CuxO/Cu(111) (x≤2) surface: A combined scanning tunneling microscopy and density functional theory study

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Liu, Ping; An, Wei; Stacchiola, Dario; Xu, Fang

    2015-10-16

    Potassium (K) plays an essential role in promoting catalytic reaction in many established industrial catalytic processes. Here, we report a combined study using scanning tunneling microscopy (STM) and density functional theory (DFT) in understanding the effect of depositing K on the atomic and electronic structures as well as chemical activities of CuxO/Cu(111) (x≤2). The DFT calculations observe a pseudomorphic growth of K on CuxO/Cu(111) up to 0.19 monolayer (ML) of coverage, where K binds the surface via strong ionic interaction with chemisorbed oxygen and the relatively weak electrostatic interactions with copper ions, lower and upper oxygen on the CuxO rings.more » The simulated STM pattern based on the DFT results agrees well with the experimental observations. The deposited K displays great impact on the surface electronic structure of CuxO/Cu(111), which induces significant reduction in work function and leads to a strong electron polarization on the surface. The promotion of K on the surface binding properties is selective. It varies depending on the nature of adsorbates. According to our results, K has little effect on surface acidity, while it enhances the surface basicity significantly. As a consequence, the presence of K does not help for CO adsorption on CuxO/Cu(111), but being able to accelerate the activation of CO2. Thus, such promotion strongly depends on the combinations from both geometric and electronic effects. Our results highlight the origin of promoting effect of alkalis in the design of catalysts for the complex reactions.« less

  4. Direct imaging of crystal structure and defects in metastable Ge{sub 2}Sb{sub 2}Te{sub 5} by quantitative aberration-corrected scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Ross, Ulrich; Lotnyk, Andriy Thelander, Erik; Rauschenbach, Bernd

    2014-03-24

    Knowledge about the atomic structure and vacancy distribution in phase change materials is of foremost importance in order to understand the underlying mechanism of fast reversible phase transformation. In this Letter, by combining state-of-the-art aberration-corrected scanning transmission electron microscopy with image simulations, we are able to map the local atomic structure and composition of a textured metastable Ge{sub 2}Sb{sub 2}Te{sub 5} thin film deposited by pulsed laser deposition with excellent spatial resolution. The atomic-resolution scanning transmission electron microscopy investigations display the heterogeneous defect structure of the Ge{sub 2}Sb{sub 2}Te{sub 5} phase. The obtained results are discussed. Highly oriented Ge{sub 2}Sb{sub 2}Te{sub 5} thin films appear to be a promising approach for further atomic-resolution investigations of the phase change behavior of this material class.

  5. Potential variation around grain boundaries in BaSi{sub 2} films grown on multicrystalline silicon evaluated using Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Baba, Masakazu; Tsukahara, Daichi; Toko, Kaoru; Hara, Kosuke O.; Usami, Noritaka; Sekiguchi, Takashi; Suemasu, Takashi

    2014-12-21

    Potential variations across the grain boundaries (GBs) in a 100?nm thick undoped n-BaSi{sub 2} film on a cast-grown multicrystalline Si (mc-Si) substrate are evaluated using Kelvin probe force microscopy (KFM). The ?-2? X-ray diffraction pattern reveals diffraction peaks, such as (201), (301), (410), and (411) of BaSi{sub 2}. Local-area electron backscatter diffraction reveals that the a-axis of BaSi{sub 2} is tilted slightly from the surface normal, depending on the local crystal plane of the mc-Si. KFM measurements show that the potentials are not significantly disordered in the grown BaSi{sub 2}, even around the GBs of mc-Si. The potentials are higher at GBs of BaSi{sub 2} around Si GBs that are formed by grains with a Si(111) face and those with faces that deviate slightly from Si(111). Thus, downward band bending occurs at these BaSi{sub 2} GBs. Minority carriers (holes) undergo a repelling force near the GBs, which may suppress recombination as in the case of undoped n-BaSi{sub 2} epitaxial films on a single crystal Si(111) substrate. The barrier height for hole transport across the GBs varies in the range from 10 to 55?meV. The potentials are also higher at the BaSi{sub 2} GBs grown around Si GBs composed of grains with Si(001) and Si(111) faces. The barrier height for hole transport ranges from 5 to 55?meV. These results indicate that BaSi{sub 2} GBs formed on (111)-dominant Si surfaces do not have a negative influence on the minority-carrier properties, and thus BaSi{sub 2} formed on underlayers, such as (111)-oriented Si or Ge and on (111)-oriented mc-Si, can be utilized as a solar cell active layer.

  6. Chemical Imaging Analysis of Environmental Particles Using the Focused Ion Beam/Scanning Electron Microscopy Technique: Microanalysis Insights into Atmospheric Chemistry of Fly Ash

    SciTech Connect (OSTI)

    Chen, Haihan; Grassian, Vicki H.; Saraf, Laxmikant V.; Laskin, Alexander

    2013-01-21

    Airborne fly ash from coal combustion may represent a source of bioavailable iron (Fe) in the open ocean. However, few studies have been made focusing on Fe speciation and distribution in coal fly ash. In this study, chemical imaging of fly ash has been performed using a dual-beam FIB/SEM (focused ion beam/scanning electron microscope) system for a better understanding of how simulated atmospheric processing modify the morphology, chemical compositions and element distributions of individual particles. A novel approach has been applied for cross-sectioning of fly ash specimen with a FIB in order to explore element distribution within the interior of individual particles. Our results indicate that simulated atmospheric processing causes disintegration of aluminosilicate glass, a dominant material in fly ash particles. Aluminosilicate-phase Fe in the inner core of fly ash particles is more easily mobilized compared with oxide-phase Fe present as surface aggregates on fly ash spheres. Fe release behavior depends strongly on Fe speciation in aerosol particles. The approach for preparation of cross-sectioned specimen described here opens new opportunities for particle microanalysis, particular with respect to inorganic refractive materials like fly ash and mineral dust.

  7. Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging

    SciTech Connect (OSTI)

    Guo, Senli; Santiago, Solares D; Mochalin, Vadym; Neitzel, Ioannis; Gogotsi, Yury G.; Kalinin, Sergei V; Jesse, Stephen

    2012-01-01

    Force-based scanning probe microscopies have emerged as a mainstay for probing structural and mechanical properties of materials on the nanometer and molecular scales. Despite tremendous progress achieved to date, the cantilever dynamics in single frequency scanning probe microscopies (SPM) is undefined due to having only two output variables. Here we demonstrate on diamond nanoparticles with different functionalization layers that the use of broad band detection by multiple frequency SPM allows complete information on tip-surface interactions in intermittent contact SPM to be acquired. The obtained data allows sub-3nm resolution even in ambient environment. By tuning the strength of tip-surface interaction, the information on surface state can be obtained.

  8. Scanning Transmission Electron Microscopy Investigations of Complex...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    oxidation of light paraffins and olefins, as well as the partial oxidation of methanol. We present HAADF-STEM investigations of various complex oxide phases and show that...

  9. Optoacoustic Microscopy for Investigation of MaterialNanostructures...

    Office of Scientific and Technical Information (OSTI)

    Title: Optoacoustic Microscopy for Investigation of Material ... of a new type of scanning acoustic microscope for ... to conventional lightwave or electron microscopies. ...

  10. Radiation-thermoacoustic microscopy of condensed media

    SciTech Connect (OSTI)

    Lyamshev, L.M.; Chelnokov, B.I.

    1984-07-01

    Possibilities are discussed for the application of scanning radiation-thermoacoustic microscopy, using different types of radiation, for microstructure analysis. (AIP)

  11. Microscopy (XSD-MIC) | Advanced Photon Source

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microdiffraction, fluorescence tomography, coherent diffraction, and synchrotron x-ray scanning tunneling microscopy (SX-STM) This website is intended to provide useful...

  12. Potassium-induced effect on structure and chemical activity of CuxO/Cu(111) (x?2) surface: A combined scanning tunneling microscopy and density functional theory study

    SciTech Connect (OSTI)

    Liu, Ping; An, Wei; Stacchiola, Dario; Xu, Fang

    2015-10-16

    Potassium (K) plays an essential role in promoting catalytic reaction in many established industrial catalytic processes. Here, we report a combined study using scanning tunneling microscopy (STM) and density functional theory (DFT) in understanding the effect of depositing K on the atomic and electronic structures as well as chemical activities of CuxO/Cu(111) (x?2). The DFT calculations observe a pseudomorphic growth of K on CuxO/Cu(111) up to 0.19 monolayer (ML) of coverage, where K binds the surface via strong ionic interaction with chemisorbed oxygen and the relatively weak electrostatic interactions with copper ions, lower and upper oxygen on the CuxO rings. The simulated STM pattern based on the DFT results agrees well with the experimental observations. The deposited K displays great impact on the surface electronic structure of CuxO/Cu(111), which induces significant reduction in work function and leads to a strong electron polarization on the surface. The promotion of K on the surface binding properties is selective. It varies depending on the nature of adsorbates. According to our results, K has little effect on surface acidity, while it enhances the surface basicity significantly. As a consequence, the presence of K does not help for CO adsorption on CuxO/Cu(111), but being able to accelerate the activation of CO2. Thus, such promotion strongly depends on the combinations from both geometric and electronic effects. Our results highlight the origin of promoting effect of alkalis in the design of catalysts for the complex reactions.

  13. Sub-microsecond-resolution probe microscopy

    DOE Patents [OSTI]

    Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

    2014-04-01

    Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

  14. Scanning optical microscope with long working distance objective

    DOE Patents [OSTI]

    Cloutier, Sylvain G. (Newark, DE)

    2010-10-19

    A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.

  15. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with...

  16. Dynamic Transmission Electron Microscopy

    SciTech Connect (OSTI)

    Evans, James E.; Jungjohann, K. L.; Browning, Nigel D.

    2012-10-12

    Dynamic transmission electron microscopy (DTEM) combines the benefits of high spatial resolution electron microscopy with the high temporal resolution of ultrafast lasers. The incorporation of these two components into a single instrument provides a perfect platform for in situ observations of material processes. However, previous DTEM applications have focused on observing structural changes occurring in samples exposed to high vacuum. Therefore, in order to expand the pump-probe experimental regime to more natural environmental conditions, in situ gas and liquid chambers must be coupled with Dynamic TEM. This chapter describes the current and future applications of in situ liquid DTEM to permit time-resolved atomic scale observations in an aqueous environment, Although this chapter focuses mostly on in situ liquid imaging, the same research potential exists for in situ gas experiments and the successful integration of these techniques promises new insights for understanding nanoparticle, catalyst and biological protein dynamics with unprecedented spatiotemporal resolution.

  17. Spectrophotometric probe

    DOE Patents [OSTI]

    Prather, William S. (Augusta, GA); O'Rourke, Patrick E. (Martinez, GA)

    1994-01-01

    A support structure bearing at least one probe for making spectrophotometric measurements of a fluid using a source of light and a spectrophotometer. The probe includes a housing with two optical fibers and a planoconvex lens. A sleeve bearing a mirror surrounds the housing. The lens is separated from the mirror by a fixed distance, defining an interior space for receiving a volume of the fluid sample. A plurality of throughholes extending through the sleeve communicate between the sample volume and the exterior of the probe, all but one hole bearing a screen. A protective jacket surrounds the probe. A hollow conduit bearing a tube is formed in the wall of the probe for venting any air in the interior space when fluid enters. The probe is held at an acute angle so the optic fibers carrying the light to and from the probe are not bent severely on emergence from the probe.

  18. Spectrophotometric probe

    DOE Patents [OSTI]

    Prather, W.S.; O'Rourke, P.E.

    1994-08-02

    A support structure is described bearing at least one probe for making spectrophotometric measurements of a fluid using a source of light and a spectrophotometer. The probe includes a housing with two optical fibers and a planoconvex lens. A sleeve bearing a mirror surrounds the housing. The lens is separated from the mirror by a fixed distance, defining an interior space for receiving a volume of the fluid sample. A plurality of throughholes extending through the sleeve communicate between the sample volume and the exterior of the probe, all but one hole bearing a screen. A protective jacket surrounds the probe. A hollow conduit bearing a tube is formed in the wall of the probe for venting any air in the interior space when fluid enters. The probe is held at an acute angle so the optic fibers carrying the light to and from the probe are not bent severely on emergence from the probe. 3 figs.

  19. Free motion scanning system

    DOE Patents [OSTI]

    Sword, Charles K. (Pleasant Hills, PA)

    2000-01-01

    The present invention relates to an ultrasonic scanner system and method for the imaging of a part system, the scanner comprising: a probe assembly spaced apart from the surface of the part including at least two tracking signals for emitting radiation and a transmitter for emitting ultrasonic waves onto a surface in order to induce at least a portion of the waves to be reflected from the part, at least one detector for receiving the radiation wherein the detector is positioned to receive the radiation from the tracking signals, an analyzer for recognizing a three-dimensional location of the tracking signals based on the emitted radiation, a differential converter for generating an output signal representative of the waveform of the reflected waves, and a device such as a computer for relating said tracking signal location with the output signal and projecting an image of the resulting data. The scanner and method are particularly useful to acquire ultrasonic inspection data by scanning the probe over a complex part surface in an arbitrary scanning pattern.

  20. New Microscopy Patent Awarded | The Ames Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    New Microscopy Patent Awarded Congratulations to former Ames Laboratory staff Ning Fang and Wei Sun for being awarded a new patent, "Auto-calibrated scanning-angle prism-type total...

  1. Ultrasonic-Based Mode-Synthesizing Atomic Force Microscopy -...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microscopy in the industry Sufficiently flexible for compatibility with spectroscopic approaches such as Raman spectroscopy Easily adaptable to scanning near-field ultrasonic...

  2. Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide

    Office of Scientific and Technical Information (OSTI)

    Flakes (Journal Article) | SciTech Connect Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes Citation Details In-Document Search Title: Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes We performed ultrafast optical microscopy on single flakes of atomically thin CVD-grown molybdenum disulfide, using non-degenerate femtosecond pump-probe spectroscopy to excite and probe carriers above and below the indirect and direct band gaps. These

  3. Optical probe

    DOE Patents [OSTI]

    Hencken, Kenneth (Pleasanton, CA); Flower, William L. (Livermore, CA)

    1999-01-01

    A compact optical probe is disclosed particularly useful for analysis of emissions in industrial environments. The instant invention provides a geometry for optically-based measurements that allows all optical components (source, detector, rely optics, etc.) to be located in proximity to one another. The geometry of the probe disclosed herein provides a means for making optical measurements in environments where it is difficult and/or expensive to gain access to the vicinity of a flow stream to be measured. Significantly, the lens geometry of the optical probe allows the analysis location within a flow stream being monitored to be moved while maintaining optical alignment of all components even when the optical probe is focused on a plurality of different analysis points within the flow stream.

  4. Probing oxygen vacancy concentration and homogeneity in solid...

    Office of Scientific and Technical Information (OSTI)

    Here, we develop an approach for direct mapping of oxygen vacancy concentrations based on local lattice parameter measurements by scanning transmission electron microscopy. The ...

  5. Low-temperature evolution of local polarization properties of PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} thin films probed by piezoresponse force microscopy

    SciTech Connect (OSTI)

    Andreeva, N. V.; Filimonov, A. V.; Rudskoy, A. I.; Tyunina, M.; Pertsev, N. A. Vakhrushev, S. B.

    2014-03-17

    The temperature evolution of local polarization properties in epitaxial PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} films is studied by the low-temperature piezoresponse force microscopy (PFM). Pronounced changes in the film polarization state, including apparent polarization rotations and possible transitions between single-domain and polydomain states of individual ferroelectric nanocolumns, are revealed on cooling from the room temperature to 8?K using PFM imaging. More than two-fold increase in the coercive voltage extracted from the piezoresponse hysteresis loops is found on cooling from 240 to 8?K. The results are explained by the thermodynamic theory of strained epitaxial perovskite ferroelectric films.

  6. Optoacoustic Microscopy for Investigation of Material

    Office of Scientific and Technical Information (OSTI)

    Nanostructures-Embracing the Ultrasmall, Ultrafast, and the Invisible (Technical Report) | SciTech Connect Optoacoustic Microscopy for Investigation of Material Nanostructures-Embracing the Ultrasmall, Ultrafast, and the Invisible Citation Details In-Document Search Title: Optoacoustic Microscopy for Investigation of Material Nanostructures-Embracing the Ultrasmall, Ultrafast, and the Invisible The goal of this grant was the development of a new type of scanning acoustic microscope for

  7. NREL: Measurements and Characterization - Atomic Force Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Force Microscopy Atomic Force Microscopy (AFM) operates in several modes. In contact mode, a tip that is attached to a cantilever is scanned over the sample surface, while the force between tip and sample is measured. While the tip is scanned laterally, the force is kept constant by moving the cantilever/tip assembly up and down, so that the deflection of the cantilever is kept constant. The vertical movement of the cantilever/tip assembly is recorded and used to generate an image of the

  8. Scanning Photocurrent Microscopy of Si and Ge nanowires (Conference...

    Office of Scientific and Technical Information (OSTI)

    Have feedback or suggestions for a way to improve these results? Save Share this Record Citation Formats MLA APA Chicago Bibtex Export Metadata Endnote Excel CSV XML Save to My ...

  9. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Record-Setting Microscopy Illuminates Energy Storage Materials Print Thursday, 22 January 2015 12:10 X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics.

  10. Smart align -- A new tool for robust non-rigid registration of scanning microscope data

    SciTech Connect (OSTI)

    Jones, Lewys; Yang, Hao; Pennycook, Timothy J.; Marshall, Matthew S. J.; Van Aert, Sandra; Browning, Nigel D.; Castell, Martin R.; Nellist, Peter D.

    2015-07-10

    Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the careful alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated.

  11. Smart align -- A new tool for robust non-rigid registration of scanning microscope data

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Jones, Lewys; Yang, Hao; Pennycook, Timothy J.; Marshall, Matthew S. J.; Van Aert, Sandra; Browning, Nigel D.; Castell, Martin R.; Nellist, Peter D.

    2015-07-10

    Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the carefulmore » alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated.« less

  12. Electron Microscopy Center

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Argonne National Laboratory Electron Microscopy Center Argonne Home > EMC > EMC Home Electron Microscopy Center Web Site has moved This page has moved to http://www.anl.gov/cnm/group/electron-microscopy-center. UChicago Argonne LLC Privacy & Security Notice

  13. Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Seo, Minah; Yamaguchi, Hisato; Mohite, Aditya D.; Boubanga-Tombet, Stephane; Blancon, Jean-Christophe; Najmaei, Sina; Ajayan, Pulickel M.; Lou, Jun; Taylor, Antoinette J.; Prasankumar, Rohit P.

    2016-02-15

    We performed ultrafast optical microscopy on single flakes of atomically thin CVD-grown molybdenum disulfide, using non-degenerate femtosecond pump-probe spectroscopy to excite and probe carriers above and below the indirect and direct band gaps. These measurements reveal the influence of layer thickness on carrier dynamics when probing near the band gap. Furthermore, fluence-dependent measurements indicate that carrier relaxation is primarily influenced by surface-related defect and trap states after above-bandgap photoexcitation. Furthermore, the ability to probe femtosecond carrier dynamics in individual flakes can thus give much insight into light-matter interactions in these two-dimensional nanosystems.

  14. Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D Mapping of

    Office of Scientific and Technical Information (OSTI)

    Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials (Technical Report) | SciTech Connect Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D Mapping of Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials Citation Details In-Document Search Title: Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D Mapping of Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials This project

  15. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong (Alameda, CA); Gao, Chen (Anhui, CN); Schultz, Peter G. (La Jolla, CA); Wei, Tao (Sunnyvale, CA)

    2003-01-01

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  16. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong (Alameda, CA); Gao, Chen (Alameda, CA)

    2001-01-01

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  17. Subangstrom Edge Relaxations Probed by Electron Microscopy in...

    Office of Scientific and Technical Information (OSTI)

    Date: 2012-11-01 OSTI Identifier: 1101784 Type: Publisher's Accepted Manuscript Journal Name: Physical Review Letters Additional Journal Information: Journal Volume: 109;...

  18. Modulated microwave microscopy and probes used therewith (Patent...

    Office of Scientific and Technical Information (OSTI)

    downwardly from the end of a cantilever. A transmission line connecting the tip electrode to the electronic control system extends along the cantilever and is separated from a ...

  19. Customized atomic force microscopy probe by focused-ion-beam...

    Office of Scientific and Technical Information (OSTI)

    We show experimentally that tall (18 m) cantilever tips fabricated by this approach reduce squeeze-film damping, which fits predictions from hydrodynamic theory, and results in ...

  20. Electric contributions to magnetic force microscopy response from graphene and MoS{sub 2} nanosheets

    SciTech Connect (OSTI)

    Li, Lu Hua Chen, Ying

    2014-12-07

    Magnetic force microscopy (MFM) signals have recently been detected from whole pieces of mechanically exfoliated graphene and molybdenum disulfide (MoS{sub 2}) nanosheets, and magnetism of the two nanomaterials was claimed based on these observations. However, non-magnetic interactions or artefacts are commonly associated with MFM signals, which make the interpretation of MFM signals not straightforward. A systematic investigation has been done to examine possible sources of the MFM signals from graphene and MoS{sub 2} nanosheets and whether the MFM signals can be correlated with magnetism. It is found that the MFM signals have significant non-magnetic contributions due to capacitive and electrostatic interactions between the nanosheets and conductive cantilever tip, as demonstrated by electric force microscopy and scanning Kevin probe microscopy analyses. In addition, the MFM signals of graphene and MoS{sub 2} nanosheets are not responsive to reversed magnetic field of the magnetic cantilever tip. Therefore, the observed MFM response is mainly from electric artefacts and not compelling enough to correlate with magnetism of graphene and MoS{sub 2} nanosheets.

  1. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    (2) periodicity (2) probes (2) scanning probe microscopy (2) scanning tunneling microscopy ... Sergei V Reflection high energy electron diffraction (RHEED) has by now ...

  2. Hydrodynamic ultrasonic probe

    DOE Patents [OSTI]

    Day, Robert A. (Livermore, CA); Conti, Armond E. (San Jose, CA)

    1980-01-01

    An improved probe for in-service ultrasonic inspection of long lengths of a workpiece, such as small diameter tubing from the interior. The improved probe utilizes a conventional transducer or transducers configured to inspect the tubing for flaws and/or wall thickness variations. The probe utilizes a hydraulic technique, in place of the conventional mechanical guides or bushings, which allows the probe to move rectilinearly or rotationally while preventing cocking thereof in the tube and provides damping vibration of the probe. The probe thus has lower friction and higher inspection speed than presently known probes.

  3. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2009-06-23

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  4. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2013-01-22

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  5. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  6. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  7. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  8. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  9. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  10. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  11. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  12. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  13. Electron Microscopy Lab

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Lab Electron Microscopy Lab Focusing on the study of microstructures with electron and ion beam instruments, including crystallographic and chemical techniques. April 12, 2012 Transmission electron microscope Rob Dickerson examines a multiphase oxide scale using the FEI Titan 80-300 transmission electron microscope. Contact Rob Dickerson (505) 667-6337 Email Rod McCabe (505) 606-1649 Email Pat Dickerson (505) 665-3036 Email Tom Wynn (505) 665-6861 Email Dedicated to the

  14. ARM Scanning Radar

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    (fixed elevation) 3. Sector scan (for cloud tracking) 4. Staring mode 3D-Cloud Products Case Study - Marine Stratocumulus 75 o Horizontal Wind Height In-cloud horizontal wind and...

  15. Nonlinear vibrational microscopy

    DOE Patents [OSTI]

    Holtom, Gary R. (Richland, WA); Xie, Xiaoliang Sunney (Richland, WA); Zumbusch, Andreas (Munchen, DE)

    2000-01-01

    The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. Microscopic imaging with a vibrational spectroscopic contrast is achieved by generating signals in a nonlinear optical process and spatially resolved detection of the signals. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a. directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b. collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c. removing the residual beam; and d. detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution then IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers. CARS and SFG microscopy does not rely on the presence of fluorophores, but retains the resolution and three-dimensional sectioning capability of confocal and two-photon fluorescence microscopy. Complementary to these techniques, CARS and SFG microscopy provides a contrast mechanism based on vibrational spectroscopy. This vibrational contrast mechanism, combined with an unprecedented high sensitivity at a tolerable laser power level, provides a new approach for microscopic investigations of chemical and biological samples.

  16. Sandia Energy - Sandia-California Partners with Japanese National...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Dr. An is an internationally recognized expert on scanning probe microscopy, such as atomic force microscopy and scanning tunneling microscopy, and regularly visits...

  17. Scanning ARM Cloud Radars Part I: Operational Sampling Strategies

    SciTech Connect (OSTI)

    Kollias, Pavlos; Bharadwaj, Nitin; Widener, Kevin B.; Jo, Ieng; Johnson, Karen

    2014-03-01

    Probing clouds in three-dimensions has never been done with scanning millimeter-wavelength (cloud) radars in a continuous operating environment. The acquisition of scanning cloud radars by the Atmospheric Radiation Measurement (ARM) program and research institutions around the world generate the need for developing operational scan strategies for cloud radars. Here, the first generation of sampling strategies for the Scanning ARM Cloud Radars (SACRs) is discussed. These scan strategies are designed to address the scientific objectives of the ARM program, however, they introduce an initial framework for operational scanning cloud radars. While the weather community uses scan strategies that are based on a sequence of scans at constant elevations, the SACRs scan strategies are based on a sequence of scans at constant azimuth. This is attributed to the cloud properties that are vastly different for rain and snow shafts that are the primary target of precipitation radars. A cloud surveillance scan strategy is introduced (HS-RHI) based on a sequence of horizon-to-horizon Range Height Indicator (RHI) scans that sample the hemispherical sky (HS). The HS-RHI scan strategy is repeated every 30 min to provide a static view of the cloud conditions around the SACR location. Between HS-RHI scan strategies other scan strategies are introduced depending on the cloud conditions. The SACRs are pointing vertically in the case of measurable precipitation at the ground. The radar reflectivities are corrected for water vapor attenuation and non-meteorological detection are removed. A hydrometeor detection mask is introduced based on the difference of cloud and noise statistics is discussed.

  18. Tip Based Near Field Optical Microscopy - Past, Present and Future

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    (Friday, March 11) | The Ames Laboratory Tip Based Near Field Optical Microscopy - Past, Present and Future (Friday, March 11) DATE: Friday, March 11, 1:10 pm LOCATION: 3043 ECpe Building Addition H. Kumar Wickramasinghe, Chairman EECS and The Henry Samueli Endowed Chair Professor, University of California, Irvine Near field scanning optical microscopy (NSOM) has evolved into a rich field of study with many different variants over the past 25 years. Following a brief review of the

  19. Vector generator scan converter

    DOE Patents [OSTI]

    Moore, James M. (Livermore, CA); Leighton, James F. (Livermore, CA)

    1990-01-01

    High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O (input/output) channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardward for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold.

  20. Vector generator scan converter

    DOE Patents [OSTI]

    Moore, J.M.; Leighton, J.F.

    1988-02-05

    High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardware for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold. 7 figs.

  1. Scanning computed confocal imager

    DOE Patents [OSTI]

    George, John S. (Los Alamos, NM)

    2000-03-14

    There is provided a confocal imager comprising a light source emitting a light, with a light modulator in optical communication with the light source for varying the spatial and temporal pattern of the light. A beam splitter receives the scanned light and direct the scanned light onto a target and pass light reflected from the target to a video capturing device for receiving the reflected light and transferring a digital image of the reflected light to a computer for creating a virtual aperture and outputting the digital image. In a transmissive mode of operation the invention omits the beam splitter means and captures light passed through the target.

  2. Electrical resistivity probes

    DOE Patents [OSTI]

    Lee, Ki Ha; Becker, Alex; Faybishenko, Boris A.; Solbau, Ray D.

    2003-10-21

    A miniaturized electrical resistivity (ER) probe based on a known current-voltage (I-V) electrode structure, the Wenner array, is designed for local (point) measurement. A pair of voltage measuring electrodes are positioned between a pair of current carrying electrodes. The electrodes are typically about 1 cm long, separated by 1 cm, so the probe is only about 1 inch long. The electrodes are mounted to a rigid tube with electrical wires in the tube and a sand bag may be placed around the electrodes to protect the electrodes. The probes can be positioned in a borehole or on the surface. The electrodes make contact with the surrounding medium. In a dual mode system, individual probes of a plurality of spaced probes can be used to measure local resistance, i.e. point measurements, but the system can select different probes to make interval measurements between probes and between boreholes.

  3. Atomically resolved force microscopy at room temperature

    SciTech Connect (OSTI)

    Morita, Seizo

    2014-04-24

    Atomic force microscopy (AFM) can now not only image individual atoms but also construct atom letters using atom manipulation method even at room temperature (RT). Therefore, the AFM is the second generation atomic tool following the scanning tunneling microscopy (STM). However the AFM can image even insulating atoms, and also directly measure/map the atomic force and potential at the atomic scale. Noting these advantages, we have been developing a bottom-up nanostructuring system at RT based on the AFM. It can identify chemical species of individual atoms and then manipulate selected atom species to the predesigned site one-by-one to assemble complex nanostructures consisted of multi atom species at RT. Here we introduce our results toward atom-by-atom assembly of composite nanostructures based on the AFM at RT including the latest result on atom gating of nano-space for atom-by-atom creation of atom clusters at RT for semiconductor surfaces.

  4. Thermal expansion recovery microscopy: Practical design considerations

    SciTech Connect (OSTI)

    Mingolo, N. Martnez, O. E.

    2014-01-15

    A detailed study of relevant parameters for the design and operation of a photothermal microscope technique recently introduced is presented. The technique, named thermal expansion recovery microscopy (ThERM) relies in the measurement of the defocusing introduced by a surface that expands and recovers upon the heating from a modulated source. A new two lens design is presented that can be easily adapted to commercial infinite conjugate microscopes and the sensitivity to misalignment is analyzed. The way to determine the beam size by means of a focus scan and the use of that same scan to verify if a thermoreflectance signal is overlapping with the desired ThERM mechanism are discussed. Finally, a method to cancel the thermoreflectance signal by an adequate choice of a nanometric coating is presented.

  5. Untitled Document

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Digital Instruments Scanning Probe Microscopy with AFM capabilties and Hysitron Nano Indenter Back to Equipment...

  6. Only critical information was scanned

    Office of Legacy Management (LM)

    Only critical information was scanned. Entire document is available upon request - Click here to email a

  7. High temperature probe

    DOE Patents [OSTI]

    Swan, Raymond A.

    1994-01-01

    A high temperature probe for sampling, for example, smokestack fumes, and is able to withstand temperatures of 3000.degree. F. The probe is constructed so as to prevent leakage via the seal by placing the seal inside the water jacket whereby the seal is not exposed to high temperature, which destroys the seal. The sample inlet of the probe is also provided with cooling fins about the area of the seal to provide additional cooling to prevent the seal from being destroyed. Also, a heated jacket is provided for maintaining the temperature of the gas being tested as it passes through the probe. The probe includes pressure sensing means for determining the flow velocity of an efficient being sampled. In addition, thermocouples are located in various places on the probe to monitor the temperature of the gas passing there through.

  8. Scanning micro-sclerometer

    DOE Patents [OSTI]

    Oliver, W.C.; Blau, P.J.

    1994-11-01

    A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch. 2 figs.

  9. Fly-scan ptychography

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Huang, Xiaojing; Lauer, Kenneth; Clark, Jesse N.; Xu, Weihe; Nazaretski, Evgeny; Harder, Ross; Robinson, Ian K.; Chu, Yong S.

    2015-03-13

    We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. This approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.

  10. Scanning micro-sclerometer

    DOE Patents [OSTI]

    Oliver, Warren C. (Knoxville, TN); Blau, Peter J. (Oak Ridge, TN)

    1994-01-01

    A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch.

  11. Fourier plane imaging microscopy

    SciTech Connect (OSTI)

    Dominguez, Daniel, E-mail: daniel.dominguez@ttu.edu; Peralta, Luis Grave de [Department of Physics, Texas Tech University, Lubbock, Texas 79409 (United States); Nano Tech Center, Texas Tech University, Lubbock, Texas 79409 (United States); Alharbi, Nouf; Alhusain, Mdhaoui [Department of Physics, Texas Tech University, Lubbock, Texas 79409 (United States); Bernussi, Ayrton A. [Nano Tech Center, Texas Tech University, Lubbock, Texas 79409 (United States); Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409 (United States)

    2014-09-14

    We show how the image of an unresolved photonic crystal can be reconstructed using a single Fourier plane (FP) image obtained with a second camera that was added to a traditional compound microscope. We discuss how Fourier plane imaging microscopy is an application of a remarkable property of the obtained FP images: they contain more information about the photonic crystals than the images recorded by the camera commonly placed at the real plane of the microscope. We argue that the experimental results support the hypothesis that surface waves, contributing to enhanced resolution abilities, were optically excited in the studied photonic crystals.

  12. Chemical sensing flow probe

    DOE Patents [OSTI]

    Laguna, George R. (Albuquerque, NM); Peter, Frank J. (Albuquerque, NM); Butler, Michael A. (Albuquerque, NM)

    1999-01-01

    A new chemical probe determines the properties of an analyte using the light absorption of the products of a reagent/analyte reaction. The probe places a small reaction volume in contact with a large analyte volume. Analyte diffuses into the reaction volume. Reagent is selectively supplied to the reaction volume. The light absorption of the reaction in the reaction volume indicates properties of the original analyte. The probe is suitable for repeated use in remote or hostile environments. It does not require physical sampling of the analyte or result in significant regent contamination of the analyte reservoir.

  13. Foldable polymers as probes

    DOE Patents [OSTI]

    Li, Alexander D. Q. (Pullman, WA); Wang, Wei (Pullman, WA)

    2007-07-03

    Disclosed herein are novel probes, which can be used to detect and identify target molecules of interest in a sample. The disclosed probes can be used to monitor conformational changes induced by molecular recognition events in addition to providing signaling the presence and/or identity of a target molecule. Methods, including solid phase synthesis techniques, for making probe molecules that exhibit changes in their optical properties upon target molecule binding are described in the disclosure. Also disclosed herein are novel chromophore moieties, which have tailored fluorescent emission spectra.

  14. Foldable polymers as probes

    DOE Patents [OSTI]

    Li, Alexander D. Q. (Pullman, WA); Wang, Wei (Pullman, WA)

    2009-07-07

    Disclosed herein are novel probes, which can be used to detect and identify target molecules of interest in a sample. The disclosed probes can be used to monitor conformational changes induced by molecular recognition events in addition to providing signaling the presence and/or identity of a target molecule. Methods, including solid phase synthesis techniques, for making probe molecules that exhibit changes in their optical properties upon target molecule binding are described in the disclosure. Also disclosed herein are novel chromophore moieties, which have tailored fluorescent emission spectra.

  15. Chemical sensing flow probe

    DOE Patents [OSTI]

    Laguna, G.R.; Peter, F.J.; Butler, M.A.

    1999-02-16

    A new chemical probe determines the properties of an analyte using the light absorption of the products of a reagent/analyte reaction. The probe places a small reaction volume in contact with a large analyte volume. Analyte diffuses into the reaction volume. Reagent is selectively supplied to the reaction volume. The light absorption of the reaction in the reaction volume indicates properties of the original analyte. The probe is suitable for repeated use in remote or hostile environments. It does not require physical sampling of the analyte or result in significant regent contamination of the analyte reservoir. 7 figs.

  16. Microscopy of photoionisation processes

    SciTech Connect (OSTI)

    Aseyev, S A; Mironov, B N; Minogin, V G; Cherkun, Aleksandr P; Chekalin, Sergei V

    2013-04-30

    A method is demonstrated which combines the ionisation of free molecules by a sharply focused femtosecond laser beam and projection microscopy in a divergent electric field. The electric field is produced in vacuum between a metallic tip and a flat positionsensitive charged particle detector. The method enables investigation of photoionisation processes in low-density gases with a subdiffraction spatial resolution and can be used as well in profile measurements for sharply focused, intense laser beams. In a demonstration experiment, a femtosecond laser beam with a peak intensity of {approx}10{sup 14} W cm{sup -2} was focused to a 40-{mu}m-diameter waist in vacuum near a millimetre-size tip and {approx}2-{mu}m spatial resolution was achieved. According to our estimates, the use of a sharper tip will ensure a submicron spatial resolution, which is a crucial condition for the spatial diagnostics of sharply focused short-wavelength VUV radiation and X-rays. (extreme light fields and their applications)

  17. The Future of Electron Microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei

    2015-05-06

    Berkeley Lab scientist Haimei Zheng discusses the future of electron microscopy and her breakthrough research into examining liquids using an electron microscope.

  18. LANL Robotic Vessel Scanning

    SciTech Connect (OSTI)

    Webber, Nels W.

    2015-11-25

    Los Alamos National Laboratory in J-1 DARHT Operations Group uses 6ft spherical vessels to contain hazardous materials produced in a hydrodynamic experiment. These contaminated vessels must be analyzed by means of a worker entering the vessel to locate, measure, and document every penetration mark on the vessel. If the worker can be replaced by a highly automated robotic system with a high precision scanner, it will eliminate the risks to the worker and provide management with an accurate 3D model of the vessel presenting the existing damage with the flexibility to manipulate the model for better and more in-depth assessment.The project was successful in meeting the primary goal of installing an automated system which scanned a 6ft vessel with an elapsed time of 45 minutes. This robotic system reduces the total time for the original scope of work by 75 minutes and results in excellent data accumulation and transmission to the 3D model imaging program.

  19. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  20. Convective heat flow probe

    DOE Patents [OSTI]

    Dunn, James C. (Albuquerque, NM); Hardee, Harry C. (Albuquerque, NM); Striker, Richard P. (Albuquerque, NM)

    1985-01-01

    A convective heat flow probe device is provided which measures heat flow and fluid flow magnitude in the formation surrounding a borehole. The probe comprises an elongate housing adapted to be lowered down into the borehole; a plurality of heaters extending along the probe for heating the formation surrounding the borehole; a plurality of temperature sensors arranged around the periphery of the probe for measuring the temperature of the surrounding formation after heating thereof by the heater elements. The temperature sensors and heater elements are mounted in a plurality of separate heater pads which are supported by the housing and which are adapted to be radially expanded into firm engagement with the walls of the borehole. The heat supplied by the heater elements and the temperatures measured by the temperature sensors are monitored and used in providing the desired measurements. The outer peripheral surfaces of the heater pads are configured as segments of a cylinder and form a full cylinder when taken together. A plurality of temperature sensors are located on each pad so as to extend along the length and across the width thereof, with a heating element being located in each pad beneath the temperature sensors. An expansion mechanism driven by a clamping motor provides expansion and retraction of the heater pads and expandable packer-type seals are provided along the probe above and below the heater pads.

  1. Convective heat flow probe

    DOE Patents [OSTI]

    Dunn, J.C.; Hardee, H.C.; Striker, R.P.

    1984-01-09

    A convective heat flow probe device is provided which measures heat flow and fluid flow magnitude in the formation surrounding a borehole. The probe comprises an elongate housing adapted to be lowered down into the borehole; a plurality of heaters extending along the probe for heating the formation surrounding the borehole; a plurality of temperature sensors arranged around the periphery of the probe for measuring the temperature of the surrounding formation after heating thereof by the heater elements. The temperature sensors and heater elements are mounted in a plurality of separate heater pads which are supported by the housing and which are adapted to be radially expanded into firm engagement with the walls of the borehole. The heat supplied by the heater elements and the temperatures measured by the temperature sensors are monitored and used in providing the desired measurements. The outer peripheral surfaces of the heater pads are configured as segments of a cylinder and form a full cylinder when taken together. A plurality of temperature sensors are located on each pad so as to extend along the length and across the width thereof, with a heating element being located in each pad beneath the temperature sensors. An expansion mechanism driven by a clamping motor provides expansion and retraction of the heater pads and expandable packet-type seals are provided along the probe above and below the heater pads.

  2. Continuous scanning mode for ptychography

    SciTech Connect (OSTI)

    Clark, Jesse N.; Huang, Xiaojing; Harder, Ross J.; Robinson, Ian K.

    2014-10-15

    We outline how ptychographic imaging can be performed without the need for discrete scan positions. Through an idealized experiment, we demonstrate how a discrete-position scan regime can be replaced with a continuously scanned one with suitable modification of the reconstruction scheme based on coherent modes. The impact of this is that acquisition times can be reduced, significantly aiding ptychographic imaging with x rays, electrons, or visible light.

  3. Multispectral imaging probe

    DOE Patents [OSTI]

    Sandison, D.R.; Platzbecker, M.R.; Descour, M.R.; Armour, D.L.; Craig, M.J.; Richards-Kortum, R.

    1999-07-27

    A multispectral imaging probe delivers a range of wavelengths of excitation light to a target and collects a range of expressed light wavelengths. The multispectral imaging probe is adapted for mobile use and use in confined spaces, and is sealed against the effects of hostile environments. The multispectral imaging probe comprises a housing that defines a sealed volume that is substantially sealed from the surrounding environment. A beam splitting device mounts within the sealed volume. Excitation light is directed to the beam splitting device, which directs the excitation light to a target. Expressed light from the target reaches the beam splitting device along a path coaxial with the path traveled by the excitation light from the beam splitting device to the target. The beam splitting device directs expressed light to a collection subsystem for delivery to a detector. 8 figs.

  4. Multispectral imaging probe

    DOE Patents [OSTI]

    Sandison, David R. (Moriarty, NM); Platzbecker, Mark R. (Albuquerque, NM); Descour, Michael R. (Tucson, AZ); Armour, David L. (Albuquerque, NM); Craig, Marcus J. (Albuquerque, NM); Richards-Kortum, Rebecca (Austin, TX)

    1999-01-01

    A multispectral imaging probe delivers a range of wavelengths of excitation light to a target and collects a range of expressed light wavelengths. The multispectral imaging probe is adapted for mobile use and use in confined spaces, and is sealed against the effects of hostile environments. The multispectral imaging probe comprises a housing that defines a sealed volume that is substantially sealed from the surrounding environment. A beam splitting device mounts within the sealed volume. Excitation light is directed to the beam splitting device, which directs the excitation light to a target. Expressed light from the target reaches the beam splitting device along a path coaxial with the path traveled by the excitation light from the beam splitting device to the target. The beam splitting device directs expressed light to a collection subsystem for delivery to a detector.

  5. Ultrasonic search wheel probe

    DOE Patents [OSTI]

    Mikesell, Charles R. (Idaho Falls, ID)

    1978-01-01

    A device is provided for reducing internal reflections from the tire of an ultrasonic search wheel probe or from within the material being examined. The device includes a liner with an anechoic chamber within which is an ultrasonic transducer. The liner is positioned within the wheel and includes an aperture through which the ultrasonic sound from the transducer is directed.

  6. Cervical Neoplasia Probe Control

    Energy Science and Technology Software Center (OSTI)

    1997-01-24

    This software, which consists of a main executive and several subroutines, performs control of the optics, image acquisition, and Digital Signal Processing (DSP) of this image, of an optical based medical instrument that performs fluoresence detection of precancerous lesions (neoplasia) of the human cervix. The hardware portion of this medical instrument is known by the same name Cervical Neoplasia Probe (CNP)

  7. Lidar arc scan uncertainty reduction through scanning geometry optimization

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Wang, H.; Barthelmie, R. J.; Pryor, S. C.; Brown, G.

    2015-10-07

    Doppler lidars are frequently operated in a mode referred to as arc scans, wherein the lidar beam scans across a sector with a fixed elevation angle and the resulting measurements are used to derive an estimate of the n minute horizontal mean wind velocity (speed and direction). Previous studies have shown that the uncertainty in the measured wind speed originates from turbulent wind fluctuations and depends on the scan geometry (the arc span and the arc orientation). This paper is designed to provide guidance on optimal scan geometries for two key applications in the wind energy industry: wind turbine powermoreperformance analysis and annual energy production. We present a quantitative analysis of the retrieved wind speed uncertainty derived using a theoretical model with the assumption of isotropic and frozen turbulence, and observations from three sites that are onshore with flat terrain, onshore with complex terrain and offshore, respectively. The results from both the theoretical model and observations show that the uncertainty is scaled with the turbulence intensity such that the relative standard error on the 10 min mean wind speed is about 30 % of the turbulence intensity. The uncertainty in both retrieved wind speeds and derived wind energy production estimates can be reduced by aligning lidar beams with the dominant wind direction, increasing the arc span and lowering the number of beams per arc scan. Large arc spans should be used at sites with high turbulence intensity and/or large wind direction variation when arc scans are used for wind resource assessment.less

  8. Cleaning of diamond nanoindentation probes with oxygen plasma and carbon dioxide snow

    SciTech Connect (OSTI)

    Morris, Dylan J. [National Institute of Standards and Technology, Materials Science and Engineering Laboratory, 100 Bureau Drive, Mail Stop 8520, Gaithersburg, Maryland 20899-8520 (United States)

    2009-12-15

    Diamond nanoindentation probes may perform thousands of indentations over years of service life. There is a broad agreement that the probes need frequent cleaning, but techniques for doing so are mostly anecdotes shared between experimentalists. In preparation for the measurement of the shape of a nanoindentation probe by a scanning probe microscope, cleaning by carbon dioxide snow jets and oxygen plasma was investigated. Repeated indentation on a thumbprint-contaminated surface formed a compound that was very resistant to removal by solvents, CO{sub 2} snow, and plasma. CO{sub 2} snow cleaning is found to be a generally effective cleaning procedure.

  9. Reproducible strain measurement in electronic devices by applying integer multiple to scanning grating in scanning moir fringe imaging

    SciTech Connect (OSTI)

    Kim, Suhyun Jung, Younheum; Kim, Joong Jung; Lee, Sunyoung; Lee, Haebum; Kondo, Yukihito

    2014-10-15

    Scanning moir fringe (SMF) imaging by high-angle annular dark field scanning transmission electron microscopy was used to measure the strain field in the channel of a transistor with a CoSi{sub 2} source and drain. Nanometer-scale SMFs were formed with a scanning grating size of d{sub s} at integer multiples of the Si crystal lattice spacing d{sub l} (d{sub s} ? nd{sub l}, n = 2, 3, 4, 5). The moir fringe formula was modified to establish a method for quantifying strain measurement. We showed that strain fields in a transistor measured by SMF images were reproducible with an accuracy of 0.02%.

  10. Transverse section radionuclide scanning system

    DOE Patents [OSTI]

    Kuhl, David E.; Edwards, Roy Q.

    1976-01-01

    This invention provides a transverse section radionuclide scanning system for high-sensitivity quantification of brain radioactivity in cross-section picture format in order to permit accurate assessment of regional brain function localized in three-dimensions. High sensitivity crucially depends on overcoming the heretofore known raster type scanning, which requires back and forth detector movement involving dead-time or partial enclosure of the scan field. Accordingly, this invention provides a detector array having no back and forth movement by interlaced detectors that enclose the scan field and rotate as an integral unit around one axis of rotation in a slip ring that continuously transmits the detector data by means of laser emitting diodes, with the advantages that increased amounts of data can be continuously collected, processed and displayed with increased sensitivity according to a suitable computer program.

  11. Multifunction Instrument Tree (MIT) Neutron and Gamma Probe Acceptance for Beneficial Use (ABU)

    SciTech Connect (OSTI)

    CANNON, N.S.

    1999-08-08

    The multifunction instrument tree (MIT) probe program has been developed to modify existing Liquid Observation Well (LOW) neutron and gamma probes for use in the validation shafts of the two MITs installed in Tank 241-SY-101. One of the program objectives is that the modified MIT probes be completely compatible with the existing LOW van instrumentation and procedures. The major program objective is to produce neutron and gamma scans from Tank 241-SY-101 that would assist in evaluating waste feature structure and elevation. The MIT probe program is described in greater detail in the engineering task plan (HNF-3322). In accordance with the engineering task plan, a test plan (HNF-3595) was written, reduced diameter (allowing insertion into the MIT validation tube) neutron and gamma probes were acquired, an acceptance and operational test procedure (HNF-3838) was written, acceptance and operational testing of the MIT probes was performed, and a report of these test results (HNF-4369) has been issued. A number of neutron and gamma probe scans have been obtained from the Tank 241-SY-101 MITs, starting on February 8, 1999, in cooperation with Operations. Now that the MIT probes are fully demonstrated, this document transfers ownership of these probes to Operations, utilizing the final acceptance for beneficial use (ABU) form that follows in Section 3.0.

  12. Intermodulation electrostatic force microscopy for imaging surface photo-voltage

    SciTech Connect (OSTI)

    Borgani, Riccardo Forchheimer, Daniel; Thorn, Per-Anders; Haviland, David B.; Bergqvist, Jonas; Ingans, Olle

    2014-10-06

    We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear capacitance gives intermodulation products of the two drive frequencies near the cantilever resonance, where they are measured with high signal to noise ratio. Analysis of this intermodulation response allows for quantitative reconstruction of the contact potential difference. We derive the theory of the method, validate it with numerical simulation and a control experiment, and we demonstrate its utility for fast imaging of the surface photo-voltage on an organic photo-voltaic material.

  13. The future of electron microscopy

    SciTech Connect (OSTI)

    Zhu, Yimei; Durr, Hermann

    2015-04-01

    Seeing is believing. So goes the old adage and seen evidence is undoubtedly satisfying because it can be interpreted easily, though not always correctly. For centuries, humans have developed such instruments as telescopes that observe the heavens and microscopes that reveal bacteria and viruses. The 2014 Nobel Prize in Chemistry was awarded to Eric Betzig, Stefan Hell, and William Moerner for their foundational work on superresolution fluorescence microscopy in which they overcame the Abbe diffraction limit for the resolving power of conventional light microscopes. (See Physics Today, December 2014, page 18.) That breakthrough enabled discoveries in biological research and testifies to the importance of modern microscopy.

  14. The future of electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhu, Yimei; Durr, Hermann

    2015-04-01

    Seeing is believing. So goes the old adage and seen evidence is undoubtedly satisfying because it can be interpreted easily, though not always correctly. For centuries, humans have developed such instruments as telescopes that observe the heavens and microscopes that reveal bacteria and viruses. The 2014 Nobel Prize in Chemistry was awarded to Eric Betzig, Stefan Hell, and William Moerner for their foundational work on superresolution fluorescence microscopy in which they overcame the Abbe diffraction limit for the resolving power of conventional light microscopes. (See Physics Today, December 2014, page 18.) That breakthrough enabled discoveries in biological research and testifiesmore » to the importance of modern microscopy.« less

  15. Ultrahigh resolution multicolor colocalization of single fluorescent probes

    DOE Patents [OSTI]

    Weiss, Shimon; Michalet, Xavier; Lacoste, Thilo D.

    2005-01-18

    A novel optical ruler based on ultrahigh-resolution colocalization of single fluorescent probes is described. Two unique families of fluorophores are used, namely energy-transfer fluorescent beads and semiconductor nanocrystal (NC) quantum dots, that can be excited by a single laser wavelength but emit at different wavelengths. A novel multicolor sample-scanning confocal microscope was constructed which allows one to image each fluorescent light emitter, free of chromatic aberrations, by scanning the sample with nanometer scale steps using a piezo-scanner. The resulting spots are accurately localized by fitting them to the known shape of the excitation point-spread-function of the microscope.

  16. Langmuir probe diagnostic suite in the C-2 field-reversed configuration

    SciTech Connect (OSTI)

    Roche, T. Armstrong, S.; Knapp, K.; Slepchenkov, M.; Sun, X.

    2014-11-15

    Several in situ probes have been designed and implemented into the diagnostic array of the C-2 field-reversed configuration (FRC) at Tri Alpha Energy [M. Tuszewski et al. (the TAE Team), Phys. Rev. Lett. 108, 255008 (2012)]. The probes are all variations on the traditional Langmuir probe. They include linear arrays of triple probes, linear arrays of single-tipped swept probes, a multi-faced Gundestrup probe, and an ion-sensitive probe. The probes vary from 5 to 7 mm diameter in size to minimize plasma perturbations. They also have boron nitride outer casings that prevent unwanted electrical breakdown and reduce the introduction of impurities. The probes are mounted on motorized linear-actuators allowing for programmatic scans of the various plasma parameters over the course of several shots. Each probe has a custom set of electronics that allows for measurement of the desired signals. High frequency ( > 5MHz) analog optical-isolators ensure that plasma parameters can be measured at sub-microsecond time scales while providing electrical isolation between machine and data acquisition systems. With these probes time-resolved plasma parameters (temperature, density, spatial potential, flow, and electric field) can be directly/locally measured in the FRC jet and edge/scrape-off layer.

  17. Identification of concrete deteriorating minerals by polarizing and scanning electron microscopy

    SciTech Connect (OSTI)

    Gregerova, Miroslava; Vsiansky, Dalibor

    2009-07-15

    The deterioration of concrete represents one of the most serious problems of civil engineering worldwide. Besides other processes, deterioration of concrete consists of sulfate attack and carbonation. Sulfate attack results in the formation of gypsum, ettringite and thaumasite in hardened concrete. Products of sulfate attack may cause a loss of material strength and a risk of collapse of the concrete constructions. The authors focused especially on the microscopical research of sulfate attack. Concrete samples were taken from the Charles Bridge in Prague, Czech Republic. A succession of degrading mineral formation was suggested. Microscope methods represent a new approach to solving the deterioration problems. They enable evaluation of the state of concrete constructions and in cooperation with hydro-geochemistry, mathematics and statistics permit prediction of the durability of a structure. Considering the number of concrete constructions and their age, research of concrete deterioration has an increasing importance. The results obtained can also be useful for future construction, because they identify the risk factors associated with formation of minerals known to degrade structures.

  18. ARM - Field Campaign - NSA Scanning Radar IOP

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    scanning radar observations for a variety of sampling modes assess the real-time signal processing of the 3-cm wave precipitation scanning radar by collecting IQ time...

  19. Center for Nanophase Materials Sciences (CNMS) - Imaging Functionality

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Capabilitiess SCANNING PROBE MICROSCOPY Advanced SPM: air, liquid, gas, 0-250°C in a controlled cell Ambient Scanning Probe Microscopy Magnetic Force Microscopy Electrical Force Microscopy Kelvin Probe Force Microscopy Conductive Atomic Force Microscopy Heated tip (blueDrive) Atomic Force Microscopy Piezoresponse and Electrochemical Strain Microscopy Band excitation PFM Switching spectroscopy PFM First order reversal curve mapping Time relaxation spectroscopy mapping Microwave Microscopy

  20. Scanning tunneling microscope nanoetching method

    DOE Patents [OSTI]

    Li, Yun-Zhong (West Lafayette, IN); Reifenberger, Ronald G. (West Lafayette, IN); Andres, Ronald P. (West Lafayette, IN)

    1990-01-01

    A method is described for forming uniform nanometer sized depressions on the surface of a conducting substrate. A tunneling tip is used to apply tunneling current density sufficient to vaporize a localized area of the substrate surface. The resulting depressions or craters in the substrate surface can be formed in information encoding patterns readable with a scanning tunneling microscope.

  1. Variable path length spectrophotometric probe

    DOE Patents [OSTI]

    O'Rourke, Patrick E. (157 Greenwood Dr., Martiney, GA 30907); McCarty, Jerry E. (104 Recreation Dr., Aiken, SC 29803); Haggard, Ricky A. (1144 Thornwood Drive, North Augusta, SC 29891)

    1992-01-01

    A compact, variable pathlength, fiber optic probe for spectrophotometric measurements of fluids in situ. The probe comprises a probe body with a shaft having a polished end penetrating one side of the probe, a pair of optic fibers, parallel and coterminous, entering the probe opposite the reflecting shaft, and a collimating lens to direct light from one of the fibers to the reflecting surface of the shaft and to direct the reflected light to the second optic fiber. The probe body has an inlet and an outlet port to allow the liquid to enter the probe body and pass between the lens and the reflecting surface of the shaft. A linear stepper motor is connected to the shaft to cause the shaft to advance toward or away from the lens in increments so that absorption measurements can be made at each of the incremental steps. The shaft is sealed to the probe body by a bellows seal to allow freedom of movement of the shaft and yet avoid leakage from the interior of the probe.

  2. Dynamic imaging with electron microscopy

    ScienceCinema (OSTI)

    Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

    2014-05-30

    Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

  3. Heat transfer probe

    DOE Patents [OSTI]

    Frank, Jeffrey I.; Rosengart, Axel J.; Kasza, Ken; Yu, Wenhua; Chien, Tai-Hsin; Franklin, Jeff

    2006-10-10

    Apparatuses, systems, methods, and computer code for, among other things, monitoring the health of samples such as the brain while providing local cooling or heating. A representative device is a heat transfer probe, which includes an inner channel, a tip, a concentric outer channel, a first temperature sensor, and a second temperature sensor. The inner channel is configured to transport working fluid from an inner inlet to an inner outlet. The tip is configured to receive at least a portion of the working fluid from the inner outlet. The concentric outer channel is configured to transport the working fluid from the inner outlet to an outer outlet. The first temperature sensor is coupled to the tip, and the second temperature sensor spaced apart from the first temperature sensor.

  4. In Situ Transmission Electron Microscopy

    Office of Scientific and Technical Information (OSTI)

    In Situ Transmission Electron Microscopy Katherine Jungjohann & Yang Liu Sandia National Laboratories, Albuquerque, New Mexico 87185 cint.lanl.gov * Adjustable HT: 100-300 kV * EDAX EDS Detector * Gatan Tridiem GIF * ADF STEM Detector * HAADF STEM Detector * BF STEM Detector * 2.0 A resolution in TEM * 1.9 A resolution in STEM * High resolution videos using Gatan Ultrascan CCD camera * Simultaneous BF and HAADF STEM imaging * EDS and EELS mapping * Energy-filtered imaging Sample Preparation

  5. Synchronized monochromator and insertion device energy scans at SLS

    SciTech Connect (OSTI)

    Krempasky, J.; Flechsig, U.; Korhonen, T.; Zimoch, D.; Quitmann, Ch.; Nolting, F.

    2010-06-23

    Synchronous monochromator and insertion device energy scans were implemented at the Surfaces/Interfaces:Microscopy (SIM) beamline in order to provide the users fast X-ray magnetic dichroism studies (XMCD). A simple software control scheme is proposed based on a fast monochromator run-time energy readback which quickly updates the insertion device requested energy during an on-the-fly X-ray absorption scan (XAS). In this scheme the Plain Grating Monochromator (PGM) motion control, being much slower compared with the insertion device (APPLE-II type undulator), acts as a 'master' controlling the undulator 'slave' energy position. This master-slave software implementation exploits EPICS distributed device control over computer network and allows for a quasi-synchronous motion control combined with data acquisition needed for the XAS or XMCD experiment.

  6. Probing battery chemistry with liquid cell electron energy loss spectroscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Unocic, Raymond R.; Baggetto, Loic; Veith, Gabriel M.; Unocic, Kinga A.; Sacci, Robert L.; Dudney, Nancy J.; More, Karren Leslie; Aguiar, Jeffery A.

    2015-09-15

    Electron energy loss spectroscopy (EELS) was used to determine the chemistry and oxidation state of LiMn2O4 and Li4Ti5O12 thin film battery electrodes in liquid cells for in situ scanning/transmission electron microscopy (S/TEM). Using the L2,3 white line intensity ratio method we determine the oxidation state of Mn and Ti in a liquid electrolyte solvent and discuss experimental parameters that influence measurement sensitivity.

  7. Electrophoresis-mass spectrometry probe

    DOE Patents [OSTI]

    Andresen, Brian D. (Pleasanton, CA); Fought, Eric R. (Livermore, CA)

    1987-01-01

    The invention involves a new technique for the separation of complex mixtures of chemicals, which utilizes a unique interface probe for conventional mass spectrometers which allows the electrophoretically separated compounds to be analyzed in real-time by a mass spectrometer. This new chemical analysis interface, which couples electrophoresis with mass spectrometry, allows complex mixtures to be analyzed very rapidly, with much greater specificity, and with greater sensitivity. The interface or probe provides a means whereby large and/or polar molecules in complex mixtures to be completely characterized. The preferred embodiment of the probe utilizes a double capillary tip which allows the probe tip to be continually wetted by the buffer, which provides for increased heat dissipation, and results in a continually operating interface which is more durable and electronically stable than the illustrated single capillary tip probe interface.

  8. Electrophoresis-mass spectrometry probe

    DOE Patents [OSTI]

    Andresen, B.D.; Fought, E.R.

    1987-11-10

    The invention involves a new technique for the separation of complex mixtures of chemicals, which utilizes a unique interface probe for conventional mass spectrometers which allows the electrophoretically separated compounds to be analyzed in real-time by a mass spectrometer. This new chemical analysis interface, which couples electrophoresis with mass spectrometry, allows complex mixtures to be analyzed very rapidly, with much greater specificity, and with greater sensitivity. The interface or probe provides a means whereby large and/or polar molecules in complex mixtures to be completely characterized. The preferred embodiment of the probe utilizes a double capillary tip which allows the probe tip to be continually wetted by the buffer, which provides for increased heat dissipation, and results in a continually operating interface which is more durable and electronically stable than the illustrated single capillary tip probe interface. 8 figs.

  9. Rotating concave eddy current probe

    DOE Patents [OSTI]

    Roach, Dennis P. (Albuquerque, NM); Walkington, Phil (Albuquerque, NM); Rackow, Kirk A. (Albuquerque, NM); Hohman, Ed (Albuquerque, NM)

    2008-04-01

    A rotating concave eddy current probe for detecting fatigue cracks hidden from view underneath the head of a raised head fastener, such as a buttonhead-type rivet, used to join together structural skins, such as aluminum aircraft skins. The probe has a recessed concave dimple in its bottom surface that closely conforms to the shape of the raised head. The concave dimple holds the probe in good alignment on top of the rivet while the probe is rotated around the rivet's centerline. One or more magnetic coils are rigidly embedded within the probe's cylindrical body, which is made of a non-conducting material. This design overcomes the inspection impediment associated with widely varying conductivity in fastened joints.

  10. Generic air sampler probe tests

    SciTech Connect (OSTI)

    Glissmeyer, J.A.; Ligotke, M.W.

    1995-11-01

    Tests were conducted to determine the best nozzle and probe designs for new air sampling systems to be installed in the ventilation systems of some of the waste tanks at the Hanford Site in Richland, Washington. Isokinetic nozzle probes and shrouded probes were tested. The test aerosol was sodium-fluorescein-tagged oleic acid. The test parameters involved particle sizes from 1 to 15 {mu}m, air velocities from 3 to 15 m/s. The results of the tests show that shrouded probes can deliver samples with significantly less particle-size bias then the isokinetic nozzle probes tested. Tests were also conducted on two sample flow splitters to determine particle loss as a function of aerodynamic particle size. The particle size range covered in these tests was 5 to 15 {mu}m. The results showed little particle loss, but did show a bias in particle concentration between the two outlets of each splitter for the larger particle sizes.

  11. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E. (Martinez, CA); Parvin, Bahram (Hercules, CA)

    2009-06-09

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time: quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  12. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E; Parvin, Bahram

    2013-10-01

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  13. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E. (Martinez, CA); Parvin, Bahram (Mill Valley, CA)

    2011-05-24

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  14. Long duration ash probe

    DOE Patents [OSTI]

    Hurley, J.P.; McCollor, D.P.; Selle, S.J.

    1994-07-26

    A long duration ash probe includes a pressure shell connected to a port in a combustor with a sample coupon mounted on a retractable carriage so as to retract the sample coupon within the pressure shell during soot blowing operation of the combustor. A valve mounted at the forward end of the pressure shell is selectively closeable to seal the sample coupon within the shell, and a heating element in the shell is operable to maintain the desired temperature of the sample coupon while retracted within the shell. The carriage is operably mounted on a pair of rails within the shell for longitudinal movement within the shell. A hollow carrier tube connects the hollow cylindrical sample coupon to the carriage, and extends through the carriage and out the rearward end thereof. Air lines are connected to the rearward end of the carrier tube and are operable to permit coolant to pass through the air lines and thence through the carrier tube to the sample coupon so as to cool the sample coupon. 8 figs.

  15. Long duration ash probe

    DOE Patents [OSTI]

    Hurley, John P. (Grand Forks, ND); McCollor, Don P. (Grand Forks, ND); Selle, Stanley J. (Grand Forks, MN)

    1994-01-01

    A long duration ash probe includes a pressure shell connected to a port in a combustor with a sample coupon mounted on a retractable carriage so as to retract the sample coupon within the pressure shell during sootblowing operation of the combustor. A valve mounted at the forward end of the pressure shell is selectively closeable to seal the sample coupon within the shell, and a heating element in the shell is operable to maintain the desired temperature of the sample coupon while retracted within the shell. The carriage is operably mounted on a pair of rails within the shell for longitudinal movement within the shell. A hollow carrier tube connects the hollow cylindrical sample coupon to the carriage, and extends through the carriage and out the rearward end thereof. Air lines are connected to the rearward end of the carrier tube and are operable to permit coolant to pass through the air lines and thence through the carrier tube to the sample coupon so as to cool the sample coupon.

  16. Optic probe for semiconductor characterization

    DOE Patents [OSTI]

    Sopori, Bhushan L. (Denver, CO); Hambarian, Artak (Yerevan, AM)

    2008-09-02

    Described herein is an optical probe (120) for use in characterizing surface defects in wafers, such as semiconductor wafers. The optical probe (120) detects laser light reflected from the surface (124) of the wafer (106) within various ranges of angles. Characteristics of defects in the surface (124) of the wafer (106) are determined based on the amount of reflected laser light detected in each of the ranges of angles. Additionally, a wafer characterization system (100) is described that includes the described optical probe (120).

  17. Fiberoptic probe and system for spectral measurements

    DOE Patents [OSTI]

    Dai, S.; Young, J.P.

    1998-10-13

    A fused fiberoptic probe, a system, method and embodiments thereof for conducting spectral measurements are disclosed. The fused fiberoptic probe comprises a probe tip having a specific geometrical configuration, an exciting optical fiber and at least one collection optical fiber fused within a housing, preferably silica. The specific geometrical configurations in which the probe tip can be shaped include a slanted probe tip with an angle greater than 0{degree}, an inverted cone-shaped probe tip, and a lens head. 12 figs.

  18. Fiberoptic probe and system for spectral measurements

    DOE Patents [OSTI]

    Dai, Sheng (Knoxville, TN); Young, Jack P. (Oak Ridge, TN)

    1998-01-01

    A fused fiberoptic probe, a system, method and embodiments thereof for conducting spectral measurements are disclosed. The fused fiberoptic probe comprises a probe tip having a specific geometrical configuration, an exciting optical fiber and at least one collection optical fiber fused within a housing, preferrably silica. The specific geometrical configurations in which the probe tip can be shaped include a slanted probe tip with an angle greater than 0.degree., an inverted cone-shaped probe tip, and a lens head.

  19. Probing Organic Transistors with Infrared Beams

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Organic Transistors with Infrared Beams Probing Organic Transistors with Infrared Beams Print Wednesday, 26 July 2006 00:00 Silicon-based transistors are well-understood,...

  20. Monitoring probe for groundwater flow

    DOE Patents [OSTI]

    Looney, B.B.; Ballard, S.

    1994-08-23

    A monitoring probe for detecting groundwater migration is disclosed. The monitor features a cylinder made of a permeable membrane carrying an array of electrical conductivity sensors on its outer surface. The cylinder is filled with a fluid that has a conductivity different than the groundwater. The probe is placed in the ground at an area of interest to be monitored. The fluid, typically saltwater, diffuses through the permeable membrane into the groundwater. The flow of groundwater passing around the permeable membrane walls of the cylinder carries the conductive fluid in the same general direction and distorts the conductivity field measured by the sensors. The degree of distortion from top to bottom and around the probe is precisely related to the vertical and horizontal flow rates, respectively. The electrical conductivities measured by the sensors about the outer surface of the probe are analyzed to determine the rate and direction of the groundwater flow. 4 figs.

  1. Monitoring probe for groundwater flow

    DOE Patents [OSTI]

    Looney, Brian B. (Aiken, SC); Ballard, Sanford (Albuquerque, NM)

    1994-01-01

    A monitoring probe for detecting groundwater migration. The monitor features a cylinder made of a permeable membrane carrying an array of electrical conductivity sensors on its outer surface. The cylinder is filled with a fluid that has a conductivity different than the groundwater. The probe is placed in the ground at an area of interest to be monitored. The fluid, typically saltwater, diffuses through the permeable membrane into the groundwater. The flow of groundwater passing around the permeable membrane walls of the cylinder carries the conductive fluid in the same general direction and distorts the conductivity field measured by the sensors. The degree of distortion from top to bottom and around the probe is precisely related to the vertical and horizontal flow rates, respectively. The electrical conductivities measured by the sensors about the outer surface of the probe are analyzed to determine the rate and direction of the groundwater flow.

  2. The Film Scanning and Reanalysis Project

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The Film Scanning National Security Science Latest Issue:July 2015 past issues All Issues submit The Film Scanning and Reanalysis Project Scientists on a search-and-rescue...

  3. Three-dimensional scanning confocal laser microscope

    DOE Patents [OSTI]

    Anderson, R. Rox (Lexington, MA); Webb, Robert H. (Lincoln, MA); Rajadhyaksha, Milind (Charlestown, MA)

    1999-01-01

    A confocal microscope for generating an image of a sample includes a first scanning element for scanning a light beam along a first axis, and a second scanning element for scanning the light beam at a predetermined amplitude along a second axis perpendicular to the first axis. A third scanning element scans the light beam at a predetermined amplitude along a third axis perpendicular to an imaging plane defined by the first and second axes. The second and third scanning element are synchronized to scan at the same frequency. The second and third predetermined amplitudes are percentages of their maximum amplitudes. A selector determines the second and third predetermined amplitudes such that the sum of the percentages is equal to one-hundred percent.

  4. IBEX probe glimpses interstellar neighborhood

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    IBEX probe glimpses interstellar neighborhood IBEX probe glimpses interstellar neighborhood Space scientists, including researchers from LANL, described the first detailed analyses of captured interstellar neutral atoms. January 31, 2012 Los Alamos National Laboratory sits on top of a once-remote mesa in northern New Mexico with the Jemez mountains as a backdrop to research and innovation covering multi-disciplines from bioscience, sustainable energy sources, to plasma physics and new materials.

  5. Atomic Scale Characterization of Compound Semiconductors Using Atom Probe Tomography

    SciTech Connect (OSTI)

    Gorman, B. P.; Norman, A. G.; Lawrence, D.; Prosa, T.; Guthrey, H.; Al-Jassim, M.

    2011-01-01

    Internal interfaces are critical in determining the performance of III-V multijunction solar cells. Studying these interfaces with atomic resolution using a combination of transmission electron microscopy (TEM), atom probe tomography (APT), and density functional calculations enables a more fundamental understanding of carrier dynamics in photovoltaic (PV) device structures. To achieve full atomic scale spatial and chemical resolution, data acquisition parameters in laser pulsed APT must be carefully studied to eliminate surface diffusion. Atom probe data with minimized group V ion clustering and expected stoichiometry can be achieved by adjusting laser pulse power, pulse repetition rate, and specimen preparation parameters such that heat flow away from the evaporating surface is maximized. Applying these improved analysis conditions to III-V based PV gives an atomic scale understanding of compositional and dopant profiles across interfaces and tunnel junctions and the initial stages of alloy clustering and dopant accumulation. Details on APT experimental methods and future in-situ instrumentation developments are illustrated.

  6. ARM: X-Band Scanning ARM Cloud Radar (XSACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    SciTech Connect (OSTI)

    Dan Nelson; Joseph Hardin; Iosif Lindenmaier; Bradley Isom; Karen Johnson; Nitin Bharadwaj

    2011-09-14

    X-Band Scanning ARM Cloud Radar (XSACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  7. ARM: Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Dan Nelson; Joseph Hardin; Iosif (Andrei) Lindenmaier; Bradley Isom; Karen Johnson; Nitin Bharadwaj

    2011-05-24

    Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  8. ARM: W-Band Scanning ARM Cloud Radar (W-SACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Dan Nelson; Joseph Hardin; Iosif (Andrei) Lindenmaier; Bradley Isom; Karen Johnson; Nitin Bharadwaj

    1990-01-01

    W-Band Scanning ARM Cloud Radar (W-SACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  9. ARM: X-Band Scanning ARM Cloud Radar (XSACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Dan Nelson; Joseph Hardin; Iosif (Andrei) Lindenmaier; Bradley Isom; Karen Johnson; Nitin Bharadwaj

    X-Band Scanning ARM Cloud Radar (XSACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  10. ARM: W-Band Scanning ARM Cloud Radar (W-SACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Dan Nelson; Joseph Hardin; Iosif (Andrei) Lindenmaier; Bradley Isom; Karen Johnson; Nitin Bharadwaj

    W-Band Scanning ARM Cloud Radar (W-SACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  11. ARM: Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Dan Nelson; Joseph Hardin; Iosif (Andrei) Lindenmaier; Bradley Isom; Karen Johnson; Nitin Bharadwaj

    Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  12. Scanning ARM Cloud Radar Handbook

    SciTech Connect (OSTI)

    Widener, K; Bharadwaj, N; Johnson, K

    2012-06-18

    The scanning ARM cloud radar (SACR) is a polarimetric Doppler radar consisting of three different radar designs based on operating frequency. These are designated as follows: (1) X-band SACR (X-SACR); (2) Ka-band SACR (Ka-SACR); and (3) W-band SACR (W-SACR). There are two SACRs on a single pedestal at each site where SACRs are deployed. The selection of the operating frequencies at each deployed site is predominantly determined by atmospheric attenuation at the site. Because RF attenuation increases with atmospheric water vapor content, ARM's Tropical Western Pacific (TWP) sites use the X-/Ka-band frequency pair. The Southern Great Plains (SGP) and North Slope of Alaska (NSA) sites field the Ka-/W-band frequency pair. One ARM Mobile Facility (AMF1) has a Ka/W-SACR and the other (AMF2) has a X/Ka-SACR.

  13. High Resolution Dopant Profiles Revealed by Atom Probe Tomography and STEM-EBIC for CdTe Based Solar Cells

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Poplawsky, Jonathan D.; Li, Chen; Paudel, Naba; Guo, Wei; Yan, Yanfa; Pennycook, Stephen J.

    2016-01-01

    Segregated elements and their diffusion profiles within grain boundaries and interfaces resulting from post deposition heat treatments are revealed using atom probe tomography (APT), scanning transmission electron microscopy (STEM), and electron beam induced current (EBIC) techniques. The results demonstrate how these techniques complement each other to provide conclusive evidence for locations of space charge regions and mechanisms that create them at the nanoscale. Most importantly, a Cl dopant profile that extends ~5 nm into CdTe grains interfacing the CdS is shown using APT and STEM synergy, which has been shown to push the pn-junction into the CdTe layer indicative ofmore » a homojunction (revealed by STEM EBIC). In addition, Cu and Cl concentrations within grain boundaries within several nms and µms from the CdS/CdTe interface are compared, Na segregation of <0.1% is detected, and S variations of ~1–3% are witnessed between CdTe grains close to the CdS/CdTe interface. The segregation and diffusion of these elements directly impacts on the material properties, such as band gap energy and n/p type properties. Optimization of the interfacial and grain boundary doping will lead to higher efficiency solar cells.« less

  14. Confocal volume in laser Raman microscopy depth profiling

    SciTech Connect (OSTI)

    Maruyama, Yutaka; Kanematsu, Wataru

    2011-11-15

    To clarify the degradation of confocality in laser Raman microscopy depth profiling (optical sectioning) and the influence of pinhole filtering on it, we investigate the confocal volume in detail based on Gaussian beam optics and scalar wave optics. Theoretical depth profiles of a homogeneous transparent sample for four different pinhole sizes, which are computed using the measured incident beam waist radius w{sub 0} and only a few optical system specific parameters such as a numerical aperture (NA) and a focal length, show a good agreement with the corresponding measured depth profiles. The computed confocal volume demonstrates that the pinhole size affects the actual probe depth as well as the axial resolution and the total intensity loss.

  15. THIS IS CANCELLED - COLLOQUIUM: Toward Diversity in Flatland...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    primarily from real-time observations by surface electron microscopy, complemented by high-resolution scanning probe microscopy and in-situ spectroscopy. Focusing on the...

  16. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Record-Setting Microscopy Illuminates Energy Storage Materials Print Thursday, 22 January 2015 12:10 X-ray microscopy...

  17. Search for: All records | DOE Patents

    Office of Scientific and Technical Information (OSTI)

    Band excitation method applicable to scanning probe microscopy Jesse, Stephen ; Kalinin, Sergei V ... in a vacuum chamber of a scanning electron microscope; connecting leads from ...

  18. X-ray microscopy. Beyond ensemble averages

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ice, Gene E.; Budai, John D.

    2015-06-23

    This work exemplifies emerging tools to characterize local materials structure and dynamics, made possible by powerful X-ray synchrotron and transmission electron microscopy methods.

  19. X-Ray Microscopy | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Microscopy X-Ray Microscopy This group exploits the unique capabilities of hard X-ray microscopy to visualize and understand the structure and behavior of hybrid, energy-related, and tailored nanomaterials The Hard X-Ray Nanoprobe, located at Sector 26 of the Advanced Photon Source (APS) and operated by our group and APS, is the only dedicated X-ray microscopy beamline within the portfolios of the nation's Nanoscale Science Research Centers. Our scientific program seeks to understand

  20. Scientific Achievement Analytical Transmission Electron Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Analytical Transmission Electron Microscopy (TEM) method was developed to determine thickness and wrinkles in electron beam sensitive 2-dimensional (2D) MFI nanosheets....

  1. Electron Microscopy Catalysis Projects: Success Stories from...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Catalysis Projects: Success Stories from the High Temperature Materials Laboratory (HTML) User Program Electron Microscopy Catalysis Projects: Success Stories from the High...

  2. Nanomanipulation and nanofabrication with multi-probe STM: From individual atoms to nanowires

    SciTech Connect (OSTI)

    Qin, Shengyong; Kim, Tae Hwan; Wang, Zhouhang; Li, An-Ping

    2012-01-01

    The wide variety of nanoscale structures and devices demands novel tools for handling, assembly, and fabrication at nanoscopic positioning precision. The manipulation tools should allow for in situ characterization and testing of fundamental building blocks, such as nanotubes and nanowires, as they are built into functional devices. In this paper, a bottom-up technique for nanomanipulation and nanofabrication is reported by using a 4-probe scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM). The applications of this technique are demonstrated in a variety of nanosystems, from manipulating individual atoms to bending, cutting, breaking carbon nanofibers, and constructing nanodevices for electrical characterizations. The combination of the wide field of view of SEM, the atomic position resolution of STM, and the flexibility of multiple scanning probes is expected to be a valuable tool for rapid prototyping in the nanoscience and nanotechnology.

  3. Hand-held survey probe

    DOE Patents [OSTI]

    Young, Kevin L. (Idaho Falls, ID) [Idaho Falls, ID; Hungate, Kevin E. (Idaho Falls, ID) [Idaho Falls, ID

    2010-02-23

    A system for providing operational feedback to a user of a detection probe may include an optical sensor to generate data corresponding to a position of the detection probe with respect to a surface; a microprocessor to receive the data; a software medium having code to process the data with the microprocessor and pre-programmed parameters, and making a comparison of the data to the parameters; and an indicator device to indicate results of the comparison. A method of providing operational feedback to a user of a detection probe may include generating output data with an optical sensor corresponding to the relative position with respect to a surface; processing the output data, including comparing the output data to pre-programmed parameters; and indicating results of the comparison.

  4. Optical Microscopy Characterization for Borehole U-15n#12 in Support of NCNS Source Physics Experiment

    SciTech Connect (OSTI)

    Wilson, Jennifer E.; Sussman, Aviva Joy

    2015-05-22

    Optical microscopy characterization of thin sections from corehole U-15n#12 is part of a larger material characterization effort for the Source Physics Experiment (SPE). The SPE program was conducted in Nevada with a series of explosive tests designed to study the generation and propagation of seismic waves inside Stock quartz monzonite. Optical microscopy analysis includes the following: 1) imaging of full thin sections (scans and mosaic maps); 2) high magnification imaging of petrographic texture (grain size, foliations, fractures, etc.); and 3) measurement of microfracture density.

  5. Hyperspectral Microscopy of Explosives Particles Using an External Cavity Quantum Cascade Laser

    SciTech Connect (OSTI)

    Phillips, Mark C.; Bernacki, Bruce E.

    2012-12-26

    Using infrared hyperspectral imaging, we demonstrate microscopy of small particles of the explosives compounds RDX, tetryl, and PETN with near diffraction-limited performance. The custom microscope apparatus includes an external cavity quantum cascade laser illuminator scanned over its tuning range of 9.13-10.53 m in four seconds, coupled with a microbolometer focal plane array to record infrared transmission images. We use the hyperspectral microscopy technique to study the infrared absorption spectra of individual explosives particles, and demonstrate sub-nanogram detection limits.

  6. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope

    SciTech Connect (OSTI)

    Imtiaz, Atif; Wallis, Thomas M.; Brubaker, Matt D.; Blanchard, Paul T.; Bertness, Kris A.; Sanford, Norman A.; Kabos, Pavel; Weber, Joel C.; Coakley, Kevin J.

    2014-06-30

    We used a broadband, atomic-force-microscope-based, scanning microwave microscope (SMM) to probe the axial dependence of the charge depletion in a p-n junction within a gallium nitride nanowire (NW). SMM enables the visualization of the p-n junction location without the need to make patterned electrical contacts to the NW. Spatially resolved measurements of S{sub 11}{sup ?}, which is the derivative of the RF reflection coefficient S{sub 11} with respect to voltage, varied strongly when probing axially along the NW and across the p-n junction. The axial variation in S{sub 11}{sup ?}? effectively mapped the asymmetric depletion arising from the doping concentrations on either side of the junction. Furthermore, variation of the probe tip voltage altered the apparent extent of features associated with the p-n junction in S{sub 11}{sup ?} images.

  7. Facile method to stain the bacterial cell surface for super-resolution fluorescence microscopy

    SciTech Connect (OSTI)

    Gunsolus, Ian L.; Hu, Dehong; Mihai, Cosmin; Lohse, Samuel E.; Lee, Chang-Soo; Torelli, Marco; Hamers, Robert J.; Murphy, Catherine; Orr, Galya; Haynes, Christy L.

    2014-01-01

    A method to fluorescently stain the surfaces of both Gram-negative and Gram-positive bacterial cells compatible with super-resolution fluorescence microscopy is presented. This method utilizes a commercially-available fluorescent probe to label primary amines at the surface of the cell. We demonstrate efficient staining of two bacterial strains, the Gram-negative Shewanella oneidensis MR-1 and the Gram-positive Bacillus subtilis 168. Using structured illumination microscopy and stochastic optical reconstruction microscopy, which require high quantum yield or specialized dyes, we show that this staining method may be used to resolve the bacterial cell surface with sub-diffraction-limited resolution. We further use this method to identify localization patterns of nanomaterials, specifically cadmium selenide quantum dots, following interaction with bacterial cells.

  8. ScanningTunneling Luminescence of Grain Boundaries in Cu(In,Ga)Se2

    SciTech Connect (OSTI)

    Romero, M. J.; Jiang, C.-S.; Al-Jassim, M. M.; Noufi, R.

    2005-01-01

    At the Laboratory, photon emission in semiconductors has been mapped in the nanoscale using scanning tunneling microscopy (STM). In this Solar Program Review Meeting, we report on the latest results obtained in Cu(In,Ga)Se2 (CIGS) thin films by this adapted STM. Scanning tunneling luminescence (STL) spectroscopy suggests that photons are emitted near the surface of CIGS. STL is excited either by (1) diffusion of tunneling electrons and subsequent recombination with available holes in CIGS or (2) impact ionization by hot electrons. Which process becomes predominant depends on the voltage applied to the STM tip. Photon mapping shows electronically active, extended defects near the surface of CIGS thin films.

  9. Flashback: Rapid scanning for radiological threats

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Flashback: Rapid scanning for radiological threats Flashback: Rapid scanning for radiological threats The ability to identify distinct material density enables the Multi-Mode Passive Detection System (MMPDS)to quickly detect unshielded to heavily shielded nuclear threats, as well as gamma rays, with near-zero false alarms. November 1, 2015 Decision Science Decision Science Decision Sciences' Multi-Mode Passive Detection System: Rapid scanning forradiological threats Click on headline to go to

  10. H2Scan LLC | Open Energy Information

    Open Energy Info (EERE)

    search Name: H2Scan LLC Place: Valencia, California Zip: 91355 Sector: Hydro, Hydrogen Product: Hydrogen specific sensing systems, uniquely able to detect hydrogen against...

  11. ScanArc ASA | Open Energy Information

    Open Energy Info (EERE)

    to: navigation, search Name: ScanArc ASA Place: Hoyanger, Norway Product: Norway-based firm that provides advice on and develops processes and applications of plasma energy....

  12. Scanned_Agreement.pdf | Department of Energy

    Energy Savers [EERE]

    Agreement.pdf Scanned_Agreement.pdf PDF icon Scanned_Agreement.pdf More Documents & Publications MOED_of_the_Italian_Republic.PDF International_Agreements_January_2001_December_2004.pdf Implementing Arrangement Between DOE and METI on R&D Cooperation on Clean Energy Technology - April 2015

  13. Scanning tunneling microscope assembly, reactor, and system

    DOE Patents [OSTI]

    Tao, Feng; Salmeron, Miquel; Somorjai, Gabor A

    2014-11-18

    An embodiment of a scanning tunneling microscope (STM) reactor includes a pressure vessel, an STM assembly, and three spring coupling objects. The pressure vessel includes a sealable port, an interior, and an exterior. An embodiment of an STM system includes a vacuum chamber, an STM reactor, and three springs. The three springs couple the STM reactor to the vacuum chamber and are operable to suspend the scanning tunneling microscope reactor within the interior of the vacuum chamber during operation of the STM reactor. An embodiment of an STM assembly includes a coarse displacement arrangement, a piezoelectric fine displacement scanning tube coupled to the coarse displacement arrangement, and a receiver. The piezoelectric fine displacement scanning tube is coupled to the coarse displacement arrangement. The receiver is coupled to the piezoelectric scanning tube and is operable to receive a tip holder, and the tip holder is operable to receive a tip.

  14. Cantilevered probe detector with piezoelectric element

    DOE Patents [OSTI]

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2012-07-10

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  15. Cantilevered probe detector with piezoelectric element

    DOE Patents [OSTI]

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2014-04-29

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  16. Cantilevered probe detector with piezoelectric element

    DOE Patents [OSTI]

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2013-04-30

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  17. Cantilevered probe detector with piezoelectric element

    DOE Patents [OSTI]

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2010-04-06

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  18. High-resolution electron microscopy of advanced materials

    SciTech Connect (OSTI)

    Mitchell, T.E.; Kung, H.H.; Sickafus, K.E.; Gray, G.T. III; Field, R.D.; Smith, J.F.

    1997-11-01

    This final report chronicles a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The High-Resolution Electron Microscopy Facility has doubled in size and tripled in quality since the beginning of the three-year period. The facility now includes a field-emission scanning electron microscope, a 100 kV field-emission scanning transmission electron microscope (FE-STEM), a 300 kV field-emission high-resolution transmission electron microscope (FE-HRTEM), and a 300 kV analytical transmission electron microscope. A new orientation imaging microscope is being installed. X-ray energy dispersive spectrometers for chemical analysis are available on all four microscopes; parallel electron energy loss spectrometers are operational on the FE-STEM and FE-HRTEM. These systems enable evaluation of local atomic bonding, as well as chemical composition in nanometer-scale regions. The FE-HRTEM has a point-to-point resolution of 1.6 {angstrom}, but the resolution can be pushed to its information limit of 1 {angstrom} by computer reconstruction of a focal series of images. HRTEM has been used to image the atomic structure of defects such as dislocations, grain boundaries, and interfaces in a variety of materials from superconductors and ferroelectrics to structural ceramics and intermetallics.

  19. Eddy current probe and method for flaw detection in metals

    DOE Patents [OSTI]

    Watjen, J.P.

    1987-06-23

    A flaw detecting system is shown which includes a probe having a pair of ferrite cores with in-line gaps in close proximity to each other. An insulating, non-magnetic, non-conducting holder fills the gaps and supports the ferrite cores in a manner such that the cores form a generally V-shape. Each core is provided with an excitation winding and a detection winding. The excitation windings are connected in series or parallel with an rf port for connection thereof to a radio frequency source. The detection windings, which are differentially wound, are connected in series circuit to a detector port for connection to a voltage measuring instrument. The ferrite cores at the in-line gaps directly engage the metal surface of a test piece, and the probe is scanned along the test piece. In the presence of a flaw in the metal surface the detection winding voltages are unbalanced, and the unbalance is detected by the voltage measuring instrument. The insulating holder is provided with a profile which conforms to that of a prominent feature of the test piece to facilitate movement of the probe along the feature, typically an edge or a corner. 9 figs.

  20. Distance Probes of Dark Energy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Kim, A. G.; Padmanabhan, N.; Aldering, G.; Allen, S. W.; Baltay, C.; Cahn, R. N.; D' Andrea, C. B.; Dalal, N.; Dawson, K. S.; Denney, K. D.; et al

    2015-03-15

    We present the results from the Distances subgroup of the Cosmic Frontier Community Planning Study (Snowmass 2013). This document summarizes the current state of the field as well as future prospects and challenges. In addition to the established probes using Type Ia supernovae and baryon acoustic oscillations, we also consider prospective methods based on clusters, active galactic nuclei, gravitational wave sirens and strong lensing time delays.

  1. Optical probe with reference fiber

    DOE Patents [OSTI]

    Da Silva, Luiz B. (Danville, CA); Chase, Charles L. (Dublin, CA)

    2006-03-14

    A system for characterizing tissue includes the steps of generating an emission signal, generating a reference signal, directing the emission signal to and from the tissue, directing the reference signal in a predetermined manner relative to the emission signal, and using the reference signal to compensate the emission signal. In one embodiment compensation is provided for fluctuations in light delivery to the tip of the probe due to cable motion.

  2. Optoacoustic Microscopy for Investigation of Material

    Office of Scientific and Technical Information (OSTI)

    Nanostructures-Embracing the Ultrasmall, Ultrafast, and the Invisible (Technical Report) | SciTech Connect SciTech Connect Search Results Technical Report: Optoacoustic Microscopy for Investigation of Material Nanostructures-Embracing the Ultrasmall, Ultrafast, and the Invisible Citation Details In-Document Search Title: Optoacoustic Microscopy for Investigation of Material Nanostructures-Embracing the Ultrasmall, Ultrafast, and the Invisible The goal of this grant was the development of a

  3. Probes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    of the Madison Symmetric Torus reversed field pinch a... ... J. S. Sarff Center for Magnetic Self-Organization in ... Since plasma is rotating in the laboratory frame and ...

  4. EEDF measurements by gridded probes

    SciTech Connect (OSTI)

    Annaratone, B.M.; Farahat, S.I.; Allen, J.E.

    1995-12-31

    A knowledge of the plasma parameters and the energy of the electrons can greatly improve the role of plasma in applications such as plasma chemistry, processing of materials, fight production and laser technology. With the development of data acquisition techniques the calculation of the EEDF from experimentally obtained probe characteristics has become increasingly utilised. The geometry of the probe is taken in account in deriving the plasma density from the ion collection part of the I-V characteristic. The electrons are ignored taking the characteristic at high negative potentials and the curves are interpreted following the radial or the orbital motion theory. Instead when the electron distribution is the object of the investigation a linearised ion contribution is often subtracted in the part of the characteristic where the ion current curvature is highest. In order to make a quantitative estimate we refer to the numerical work of Nairn et al. who calculate the ion current in radial motion for an extended range of the ratio motion for an extended range of the ratio r{sub p}/{lambda}{sub D} (radius of the cylindrical probe over the Debye distance). Radial motion has been proved to be applicable in most of the plasmas used for processing. We can compare the derivative of the ion current with respect to the voltage with the derivative of the electron retardation current which, in the normalization used, depends on the ratio of the ion to the electron mass. Let us consider, for example, a typical probe used for EEDF measurements, with r{sub p}/{lambda}{sub D} = 1 in Argon. We can see that the ion slope is already 14% of the electron slope for a floating potential only 3.6 kT{sub e}/e negative with respect to the plasma. Lighter gases, for the same voltage, will show a greater error. This work proposes the gridded probe as a reliable method to extend the measurements of the EEDF to values well negative with respect to the floating potential.

  5. pH Meter probe assembly

    DOE Patents [OSTI]

    Hale, C.J.

    1983-11-15

    An assembly for mounting a pH probe in a flowing solution, such as a sanitary sewer line, which prevents the sensitive glass portion of the probe from becoming coated with grease, oil, and other contaminants, whereby the probe gives reliable pH indication over an extended period of time. The pH probe assembly utilizes a special filter media and a timed back-rinse feature for flushing clear surface contaminants of the filter. The flushing liquid is of a known pH and is utilized to check performance of the probe. 1 fig.

  6. pH Meter probe assembly

    DOE Patents [OSTI]

    Hale, Charles J. (San Jose, CA)

    1983-01-01

    An assembly for mounting a pH probe in a flowing solution, such as a sanitary sewer line, which prevents the sensitive glass portion of the probe from becoming coated with grease, oil, and other contaminants, whereby the probe gives reliable pH indication over an extended period of time. The pH probe assembly utilizes a special filter media and a timed back-rinse feature for flushing clear surface contaminants of the filter. The flushing liquid is of a known pH and is utilized to check performance of the probe.

  7. Scanning fluorescent microthermal imaging apparatus and method

    DOE Patents [OSTI]

    Barton, Daniel L. (Albuquerque, NM); Tangyunyong, Paiboon (Albuquerque, NM)

    1998-01-01

    A scanning fluorescent microthermal imaging (FMI) apparatus and method is disclosed, useful for integrated circuit (IC) failure analysis, that uses a scanned and focused beam from a laser to excite a thin fluorescent film disposed over the surface of the IC. By collecting fluorescent radiation from the film, and performing point-by-point data collection with a single-point photodetector, a thermal map of the IC is formed to measure any localized heating associated with defects in the IC.

  8. Scanning fluorescent microthermal imaging apparatus and method

    DOE Patents [OSTI]

    Barton, D.L.; Tangyunyong, P.

    1998-01-06

    A scanning fluorescent microthermal imaging (FMI) apparatus and method is disclosed, useful for integrated circuit (IC) failure analysis, that uses a scanned and focused beam from a laser to excite a thin fluorescent film disposed over the surface of the IC. By collecting fluorescent radiation from the film, and performing point-by-point data collection with a single-point photodetector, a thermal map of the IC is formed to measure any localized heating associated with defects in the IC. 1 fig.

  9. Scanning tip microwave near field microscope

    DOE Patents [OSTI]

    Xiang, X.D.; Schultz, P.G.; Wei, T.

    1998-10-13

    A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an end wall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity. 17 figs.

  10. Scanning tip microwave near field microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong (Alameda, CA); Schultz, Peter G. (Oakland, CA); Wei, Tao (Albany, CA)

    1998-01-01

    A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

  11. High-Resolution Photocurrent Microscopy Using Near-FieldCathodolumine...

    Office of Scientific and Technical Information (OSTI)

    High-Resolution Photocurrent Microscopy Using Near-Field Cathodoluminescence of Quantum Dots. Citation Details In-Document Search Title: High-Resolution Photocurrent Microscopy ...

  12. In-Situ Electron Microscopy of Electrical Energy Storage Materials...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials Investigations of electrode interface and architecture...

  13. Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    pm029allard2011p.pdf More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst...

  14. Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    pm029allard2010p.pdf More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst...

  15. Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide...

    Office of Scientific and Technical Information (OSTI)

    Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes Citation Details In-Document Search Title: Ultrafast Optical Microscopy of Single Monolayer Molybdenum ...

  16. An In Situ Study of the Martensitic Transformation in Shape Memory Alloys Using Photoemission Electron Microscopy

    SciTech Connect (OSTI)

    Cai, Mingdong; Langford, Stephen C.; Dickinson, J. T.; Xiong, Gang; Droubay, Timothy C.; Joly, Alan G.; Beck, Kenneth M.; Hess, Wayne P.

    2007-04-15

    Thermally-induced martensitic phase transformations in polycrystalline CuZnAl and thin-film NiTiCu shape memory alloys were probed using photoemission electron microscopy (PEEM). Ultra-violet photoelectron spectroscopy shows a reversible change in the apparent work function during transformation, presumably due to the contrasting surface electronic structures of the martensite and austenite phases. In situ PEEM images provide information on the spatial distribution of these phases and the evolution of the surface microstructure during transformation. PEEM offers considerable potential for improving our understanding of martensitic transformations in shape memory alloys in real time.

  17. Fidelity imaging for atomic force microscopy

    SciTech Connect (OSTI)

    Ghosal, Sayan Salapaka, Murti

    2015-01-05

    Atomic force microscopy is widely employed for imaging material at the nanoscale. However, real-time measures on image reliability are lacking in contemporary atomic force microscopy literature. In this article, we present a real-time technique that provides an image of fidelity for a high bandwidth dynamic mode imaging scheme. The fidelity images define channels that allow the user to have additional authority over the choice of decision threshold that facilitates where the emphasis is desired, on discovering most true features on the sample with the possible detection of high number of false features, or emphasizing minimizing instances of false detections. Simulation and experimental results demonstrate the effectiveness of fidelity imaging.

  18. Physical mechanisms of megahertz vibrations and nonlinear detection in ultrasonic force and related microscopies

    SciTech Connect (OSTI)

    Bosse, J. L.; Huey, B. D.; Tovee, P. D.; Kolosov, O. V.

    2014-04-14

    Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced nanoscale property mapping to video rates, allowed use of cantilever dynamics for mapping nanomechanical properties of stiff materials, sensing ?s time scale phenomena in nanostructures, and enabled detection of subsurface features with nanoscale resolution. All of these methods critically depend on the generally poor characterized HF behaviour of AFM cantilevers in contact with a studied sample, spatial and frequency response of piezotransducers, and transfer of ultrasonic vibrations between the probe and a specimen. Focusing particularly on Ultrasonic Force Microscopy (UFM), this work is also applicable to waveguide UFM, heterodyne force microscopy, and near-field holographic microscopy, all methods that exploit nonlinear tip-surface force interactions at high frequencies. Leveraging automated multidimensional measurements, spectroscopic UFM (sUFM) is introduced to investigate a range of common experimental parameters, including piezotransducer excitation frequency, probed position, ultrasonic amplitude, cantilever geometry, spring constant, and normal force. Consistent with studies of influence of each of these factors, the data-rich sUFM signatures allow efficient optimization of ultrasonic-AFM based measurements, leading to best practices recommendations of using longer cantilevers with lower fundamental resonance, while at the same time increasing the central frequency of HF piezo-actuators, and only comparing results within areas on the order of few ?m{sup 2} unless calibrated directly or compared with in-the-imaged area standards. Diverse materials such as Si, Cr, and photoresist are specifically investigated. This work thereby provides essential insight into the reliable use of MHz vibrations with AFM and provides direct evidence substantiating phenomena such as sensitivity to adhesion, diminished friction for certain ultrasonic conditions, and the particular benefit of UFM and related methods for nanoscale mapping of stiff materials.

  19. In-situ scanning electron microscopy study of fracture events during back-end-of-line microbeam bending tests

    SciTech Connect (OSTI)

    Vanstreels, K. Zahedmanesh, H.; Bender, H.; Gonzalez, M.; De Wolf, I.; Lefebvre, J.; Bhowmick, S.

    2014-11-24

    This paper demonstrates the direct observation of crack initiation, crack propagation, and interfacial delamination events during in-situ microbeam bending tests of FIB milled BEOL structures. The elastic modulus and the critical force of fracture of the BEOL beam samples were compared for beams of different length and width.

  20. High-speed adaptive contact-mode atomic force microscopy imaging with near-minimum-force

    SciTech Connect (OSTI)

    Ren, Juan; Zou, Qingze

    2014-07-15

    In this paper, an adaptive contact-mode imaging approach is proposed to replace the traditional contact-mode imaging by addressing the major concerns in both the speed and the force exerted to the sample. The speed of the traditional contact-mode imaging is largely limited by the need to maintain precision tracking of the sample topography over the entire imaged sample surface, while large image distortion and excessive probe-sample interaction force occur during high-speed imaging. In this work, first, the image distortion caused by the topography tracking error is accounted for in the topography quantification. Second, the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next-line topography is integrated to the topography feeedback loop to enhance the sample topography tracking. The proposed approach is demonstrated and evaluated through imaging a calibration sample of square pitches at both high speeds (e.g., scan rate of 75 Hz and 130 Hz) and large sizes (e.g., scan size of 30 ?m and 80??m). The experimental results show that compared to the traditional constant-force contact-mode imaging, the imaging speed can be increased by over 30 folds (with the scanning speed at 13 mm/s), and the probe-sample interaction force can be reduced by more than 15% while maintaining the same image quality.

  1. Probing Organic Transistors with Infrared Beams

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Organic Transistors with Infrared Beams Print Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is...

  2. Probing strong electroweak symmetry breaking dynamics through...

    Office of Scientific and Technical Information (OSTI)

    This content will become publicly available on December 6, 2016 Title: Probing strong ... become publicly available on December 6, 2016 Publisher's Version of Record 10.1103...

  3. MJC Probe Inc MPI | Open Energy Information

    Open Energy Info (EERE)

    company, focusing on providing micro-contact measurement technology for microelectronics industry. References: MJC Probe Inc (MPI)1 This article is a stub. You can help...

  4. ARM - Campaign Instrument - scan-irt

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsscan-irt Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Scanning IRT (SCAN-IRT) Instrument Categories Radiometric Campaigns Cloudiness Inter-Comparison IOP [ Download Data ] Southern Great Plains, 2003.02.21 - 2003.04.21 Cloudiness Inter-Comparison IOP [ Download Data ] Southern Great Plains, 2003.02.21 - 2003.04.21 Primary Measurements Taken The following measurements are those considered scientifically

  5. Scanning and storage of electrophoretic records

    DOE Patents [OSTI]

    McKean, Ronald A. (Royal Oak, MI); Stiegman, Jeff (Ann Arbor, MI)

    1990-01-01

    An electrophoretic record that includes at least one gel separation is mounted for motion laterally of the separation record. A light source is positioned to illuminate at least a portion of the record, and a linear array camera is positioned to have a field of view of the illuminated portion of the record and orthogonal to the direction of record motion. The elements of the linear array are scanned at increments of motion of the record across the field of view to develop a series of signals corresponding to intensity of light at each element at each scan increment.

  6. In-situ spectrophotometric probe

    DOE Patents [OSTI]

    Prather, W.S.

    1992-12-15

    A spectrophotometric probe is described for in situ absorption spectra measurements comprising a first optical fiber carrying light from a remote light source, a second optical fiber carrying light to a remote spectrophotometer, the proximal ends of the first and second optical fibers parallel and co-terminal, a planoconvex lens to collimate light from the first optical fiber, a reflecting grid positioned a short distance from the lens to reflect the collimated light back to the lens for focusing on the second optical fiber. The lens is positioned with the convex side toward the optical fibers. A substrate for absorbing analyte or an analyte and reagent mixture may be positioned between the lens and the reflecting grid. 5 figs.

  7. Millimeter-wave active probe

    DOE Patents [OSTI]

    Majidi-Ahy, Gholamreza; Bloom, David M.

    1991-01-01

    A millimeter-wave active probe for use in injecting signals with frequencies above 50GHz to millimeter-wave and ultrafast devices and integrated circuits including a substrate upon which a frequency multiplier consisting of filter sections and impedance matching sections are fabricated in uniplanar transmission line format. A coaxial input and uniplanar 50 ohm transmission line couple an approximately 20 GHz input signal to a low pass filter which rolls off at approximately 25 GHz. An input impedance matching section couples the energy from the low pass filter to a pair of matched, antiparallel beam lead diodes. These diodes generate odd-numberd harmonics which are coupled out of the diodes by an output impedance matching network and bandpass filter which suppresses the fundamental and third harmonics and selects the fifth harmonic for presentation at an output.

  8. In-situ spectrophotometric probe

    DOE Patents [OSTI]

    Prather, William S. (2419 Dickey Rd., Augusta, GA 30906)

    1992-01-01

    A spectrophotometric probe for in situ absorption spectra measurements comprising a first optical fiber carrying light from a remote light source, a second optical fiber carrying light to a remote spectrophotometer, the proximal ends of the first and second optical fibers parallel and coterminal, a planoconvex lens to collimate light from the first optical fiber, a reflecting grid positioned a short distance from the lens to reflect the collimated light back to the lens for focussing on the second optical fiber. The lens is positioned with the convex side toward the optical fibers. A substrate for absorbing analyte or an analyte and reagent mixture may be positioned between the lens and the reflecting grid.

  9. X-Ray Microscopy Capabilities | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The Hard X-Ray Nanoprobe (HXN) facility provides scanning fluorescence, scanning diffraction, and full-field transmission and tomographic imaging capabilities with a spatial...

  10. Spectrometer for Sky-Scanning, Sun-Tracking Atmospheric Research...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    tmospheric R R esearch esearch 4STAR: 4STAR: Spectrometer Spectrometer for for Sky Sky - - Scanning Scanning , , Sun Sun - - Tracking Tracking Atmospheric Research...

  11. Apparatus for controlling the scan width of a scanning laser beam

    DOE Patents [OSTI]

    Johnson, G.W.

    1996-10-22

    Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board. 8 figs.

  12. Apparatus for controlling the scan width of a scanning laser beam

    DOE Patents [OSTI]

    Johnson, Gary W. (Livermore, CA)

    1996-01-01

    Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board.

  13. Tube curvature measuring probe and method

    DOE Patents [OSTI]

    Sokol, George J. (Scotia, NY)

    1990-01-01

    The present invention is directed to a probe and method for measuring the radius of curvature of a bend in a section of tubing. The probe includes a member with a pair of guide means, one located at each end of the member. A strain gauge is operatively connected to the member for detecting bending stress exrted on the member as the probe is drawn through and in engagement with the inner surface of a section of tubing having a bend. The method of the present invention includes steps utilizing a probe, like the aforementioned probe, which can be made to detect bends only in a single plane when having a fixed orientation relative the section of tubing to determine the maximum radius of curvature of the bend.

  14. Rugged fiber optic probe for raman measurement

    DOE Patents [OSTI]

    O'Rourke, Patrick E. (Martinez, GA); Toole, Jr., William R. (Aiken, SC); Nave, Stanley E. (Evans, GA)

    1998-01-01

    An optical probe for conducting light scattering analysis is disclosed. The probe comprises a hollow housing and a probe tip. A fiber assembly made up of a transmitting fiber and a receiving bundle is inserted in the tip. A filter assembly is inserted in the housing and connected to the fiber assembly. A signal line from the light source and to the spectrometer also is connected to the filter assembly and communicates with the fiber assembly. By using a spring-loaded assembly to hold the fiber connectors together with the in-line filters, complex and sensitive alignment procedures are avoided. The close proximity of the filter assembly to the probe tip eliminates or minimizes self-scattering generated by the optical fiber. Also, because the probe can contact the sample directly, sensitive optics can be eliminated.

  15. Protective shield for an instrument probe

    DOE Patents [OSTI]

    Johnsen, Howard A.; Ross, James R.; Birtola, Sal R.

    2004-10-26

    A shield is disclosed that is particularly useful for protecting exposed optical elements at the end of optical probes used in the analysis of hazardous emissions in and around an industrial environment from the contaminating effects of those emissions. The instant invention provides a hood or cowl in the shape of a right circular cylinder that can be fitted over the end of such optical probes. The hood provides a clear aperture through which the probe can perform unobstructed analysis. The probe optical elements are protected from the external environment by passing a dry gas through the interior of the hood and out through the hood aperture in sufficient quantity and velocity to prevent any significant mixing between the internal and external environments. Additionally, the hood is provided with a cooling jacket to lessen the potential for damaging the probe due to temperature excursions.

  16. Arrays of nucleic acid probes on biological chips

    DOE Patents [OSTI]

    Chee, Mark (Palo Alto, CA); Cronin, Maureen T. (Los Altos, CA); Fodor, Stephen P. A. (Palo Alto, CA); Huang, Xiaohua X. (Mt. View, CA); Hubbell, Earl A. (Mt. View, CA); Lipshutz, Robert J. (Palo Alto, CA); Lobban, Peter E. (Palo Alto, CA); Morris, MacDonald S. (San Jose, CA); Sheldon, Edward L. (Menlo Park, CA)

    1998-11-17

    DNA chips containing arrays of oligonucleotide probes can be used to determine whether a target nucleic acid has a nucleotide sequence identical to or different from a specific reference sequence. The array of probes comprises probes exactly complementary to the reference sequence, as well as probes that differ by one or more bases from the exactly complementary probes.

  17. Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

    SciTech Connect (OSTI)

    Ramos, Jorge R.

    2014-07-28

    The acquisition of high resolution images in atomic force microscopy (AFM) is correlated to the cantilever's tip shape, size, and imaging conditions. In this work, relative tip wear is quantified based on the evolution of a direct experimental observable in amplitude modulation atomic force microscopy, i.e., the critical amplitude. We further show that the scanning parameters required to guarantee a maximum compressive stress that is lower than the yield/fracture stress of the tip can be estimated via experimental observables. In both counts, the optimized parameters to acquire AFM images while preserving the tip are discussed. The results are validated experimentally by employing IgG antibodies as a model system.

  18. Frontiers of in situ electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by inmore » this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.« less

  19. Three axis velocity probe system

    DOE Patents [OSTI]

    Fasching, George E. (Morgantown, WV); Smith, Jr., Nelson S. (Morgantown, WV); Utt, Carroll E. (Morgantown, WV)

    1992-01-01

    A three-axis velocity probe system for determining three-axis positional velocities of small particles in fluidized bed systems and similar applications. This system has a sensor head containing four closely-spaced sensing electrodes of small wires that have flat ends to establish a two axis plane, e.g. a X-Y plane. Two of the sensing electrodes are positioned along one of the axes and the other two are along the second axis. These four sensing electrodes are surrounded by a guard electrode, and the outer surface is a ground electrode and support member for the sensing head. The electrodes are excited by, for example, sinusoidal voltage having a peak-to-peak voltage of up to 500 volts at a frequency of 2 MHz. Capacitive currents flowing between the four sensing electrodes and the ground electrode are influenced by the presence and position of a particle passing the sensing head. Any changes in these currents due to the particle are amplified and synchronously detected to produce positional signal values that are converted to digital form. Using these digital forms and two values of time permit generation of values of the three components of the particle vector and thus the total velocity vector.

  20. Laser scanning system for object monitoring

    DOE Patents [OSTI]

    McIntyre, Timothy James [Knoxville, TN; Maxey, Lonnie Curtis [Powell, TN; Chiaro, Jr; John, Peter [Clinton, TN

    2008-04-22

    A laser scanner is located in a fixed position to have line-of-sight access to key features of monitored objects. The scanner rapidly scans pre-programmed points corresponding to the positions of retroreflecting targets affixed to the key features of the objects. The scanner is capable of making highly detailed scans of any portion of the field of view, permitting the exact location and identity of targets to be confirmed. The security of an object is verified by determining that the cooperative target is still present and that its position has not changed. The retroreflecting targets also modulate the reflected light for purposes of returning additional information back to the location of the scanner.

  1. High-speed massively parallel scanning

    DOE Patents [OSTI]

    Decker, Derek E. (Byron, CA)

    2010-07-06

    A new technique for recording a series of images of a high-speed event (such as, but not limited to: ballistics, explosives, laser induced changes in materials, etc.) is presented. Such technique(s) makes use of a lenslet array to take image picture elements (pixels) and concentrate light from each pixel into a spot that is much smaller than the pixel. This array of spots illuminates a detector region (e.g., film, as one embodiment) which is scanned transverse to the light, creating tracks of exposed regions. Each track is a time history of the light intensity for a single pixel. By appropriately configuring the array of concentrated spots with respect to the scanning direction of the detection material, different tracks fit between pixels and sufficient lengths are possible which can be of interest in several high-speed imaging applications.

  2. Macroscopic model of scanning force microscope

    DOE Patents [OSTI]

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  3. Spectroscopic infrared near-field microscopy and x-ray reflectivity studies of order and clustering in lipid membranes

    SciTech Connect (OSTI)

    Generosi, J.; Margaritondo, G.; Sanghera, J. S.; Aggarwal, I. D.; Tolk, N. H.; Piston, D. W.; Castellano, A. Congiu; Cricenti, A.

    2006-12-04

    Lipid membranes were studied by infrared scanning near-field optical microscopy at several wavelengths and by x-ray reflectivity. Together with the x-ray data, the optical images indicate the formation of locally ordered multiple bilayers, and the topographical micrographs reveal the presence of islands at the surface, both critically important features for biotechnology and medical applications such as biosensors and gene therapy.

  4. Positron Emission Tomography (PET) and Positron Scanning

    Office of Scientific and Technical Information (OSTI)

    Positron Emission Tomography (PET) and Positron Scanning Resources with Additional Information Positron Emission Tomography (PET) Scanner Courtesy Lawrence Berkeley National Laboratory 'Positron Emission Tomography ... [is a medical imaging technique that] can track chemical reactions in living tissues and merges chemistry with biological imaging. Its strength has been in studies of the brain where there has been significant progress in investigations of drug addiction, aging, mental illness,

  5. Circular zig-zag scan video format

    DOE Patents [OSTI]

    Peterson, C. Glen (Los Alamos, NM); Simmons, Charles M. (Los Alamos, NM)

    1992-01-01

    A circular, ziz-zag scan for use with vidicon tubes. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal.

  6. Category:2-M Probe Survey | Open Energy Information

    Open Energy Info (EERE)

    2-M Probe Survey Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Geothermalpower.jpg Looking for the 2-M Probe Survey page? For detailed information on 2-M Probe...

  7. Continuous motion scan ptychography: Characterization for increased speed in coherent x-ray imaging

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Deng, Junjing; Nashed, Youssef S. G.; Chen, Si; Phillips, Nicholas W.; Peterka, Tom; Ross, Rob; Vogt, Stefan; Jacobsen, Chris; Vine, David J.

    2015-02-23

    Ptychography is a coherent diffraction imaging (CDI) method for extended objects in which diffraction patterns are acquired sequentially from overlapping coherent illumination spots. The objects complex transmission function can be reconstructed from those diffraction patterns at a spatial resolution limited only by the scattering strength of the object and the detector geometry. Most experiments to date have positioned the illumination spots on the sample using a move-settle-measure sequence in which the move and settle steps can take longer to complete than the measure step. We describe here the use of a continuous fly-scan mode for ptychographic data collection in whichmorethe sample is moved continuously, so that the experiment resembles one of integrating the diffraction patterns from multiple probe positions. This allows one to use multiple probe mode reconstruction methods to obtain an image of the object and also of the illumination function. We show in simulations, and in x-ray imaging experiments, some of the characteristics of fly-scan ptychography, including a factor of 25 reduction in the data acquisition time. This approach will become increasingly important as brighter x-ray sources are developed, such as diffraction limited storage rings.less

  8. Functional nucleic acid probes and uses thereof

    DOE Patents [OSTI]

    Nilsen-Hamilton, Marit

    2006-10-03

    The present invention provides functional nucleic acid probes, and methods of using functional nucleic acid probes, for binding a target to carry out a desired function. The probes have at least one functional nucleic acid, at least one regulating nucleic acid, and at least one attenuator. The functional nucleic acid is maintained in an inactive state by the attenuator and activated by the regulating nucleic acid only in the presence of a regulating nucleic acid target. In its activated state the functional nucleic acid can bind to its target to carry out a desired function, such as generating a signal, cleaving a nucleic acid, or catalyzing a reaction.

  9. Structure of low-density nanoporous dielectrics revealed by low-vacuum electron microscopy and small-angle x-ray scattering

    SciTech Connect (OSTI)

    Kucheyev, S O; Toth, M; Baumann, T F; Hamza, A V; Ilavsky, J; Knowles, W R; Thiel, B L; Tileli, V; van Buuren, T; Wang, Y M; Willey, T M

    2006-06-05

    We use low-vacuum scanning electron microscopy to image directly the ligament and pore size and shape distributions of representative aerogels over a wide range of length scales ({approx} 10{sup 0}-10{sup 5} nm). The images are used for unambiguous, real-space interpretation of small-angle scattering data for these complex nanoporous systems.

  10. Probing surface & transport phenomena in energy materials under...

    Office of Scientific and Technical Information (OSTI)

    Probing surface & transport phenomena in energy materials under operating conditions. Citation Details In-Document Search Title: Probing surface & transport phenomena in energy...

  11. Probing nanoscale behavior of magnetic materials with soft x...

    Office of Scientific and Technical Information (OSTI)

    Probing nanoscale behavior of magnetic materials with soft x-ray spectromicroscopy Citation Details In-Document Search Title: Probing nanoscale behavior of magnetic materials with...

  12. Design and analysis of mismatch probes for long oligonucleotide...

    Office of Scientific and Technical Information (OSTI)

    Design and analysis of mismatch probes for long oligonucleotide microarrays Citation Details In-Document Search Title: Design and analysis of mismatch probes for long...

  13. Probing novel scalar and tensor interactions from (ultra)cold...

    Office of Scientific and Technical Information (OSTI)

    Journal Article: Probing novel scalar and tensor interactions from (ultra)cold neutrons to the LHC Citation Details In-Document Search Title: Probing novel scalar and tensor ...

  14. Probing Fukushima with cosmic rays should speed cleanup

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Fukushima with cosmic rays should speed cleanup Probing Fukushima with cosmic rays should speed cleanup The initiative could reduce the time required to clean up the ...

  15. Probing Fukushima with cosmic rays should help speed cleanup...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Fukushima with cosmic rays Probing Fukushima with cosmic rays should help speed cleanup of damaged plant The initiative could reduce the time required to clean up the ...

  16. Hold Down Clamp with Integral Thermocouple Probe --- Inventor...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probe --- Inventor(s): Hans Schneider, Stephan Jurczynski and John Vaccaro This cam action hold down clamp features a thermocouple probe that provides the clamping point...

  17. Fast electron microscopy via compressive sensing

    DOE Patents [OSTI]

    Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

    2014-12-09

    Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

  18. Electron Microscopy Center Capabilities | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Capabilities ACAT: Argonne Chromatic Aberration-corrected TEM This FEI Titan 80-300 ST has a CEOS Cc/Cs corrector on the imaging side of the column to correct both spherical and chromatic aberrations. The Cc/Cs corrector also provides greatly-improved resolution and signal for energy filtered imaging and EELS. FEI Tecnai F20ST TEM/STEM This premier analytical transmission electron microscope (AEM) has specialized accessories that include an energy-dispersive x-ray

  19. Surface sampling concentration and reaction probe

    DOE Patents [OSTI]

    Van Berkel, Gary J; Elnaggar, Mariam S

    2013-07-16

    A method of analyzing a chemical composition of a specimen is described. The method can include providing a probe comprising an outer capillary tube and an inner capillary tube disposed co-axially within the outer capillary tube, where the inner and outer capillary tubes define a solvent capillary and a sampling capillary in fluid communication with one another at a distal end of the probe; contacting a target site on a surface of a specimen with a solvent in fluid communication with the probe; maintaining a plug volume proximate a solvent-specimen interface, wherein the plug volume is in fluid communication with the probe; draining plug sampling fluid from the plug volume through the sampling capillary; and analyzing a chemical composition of the plug sampling fluid with an analytical instrument. A system for performing the method is also described.

  20. 2-M Probe Survey | Open Energy Information

    Open Energy Info (EERE)

    Techniques A modified version of the 2 m temperature probe survey was tested at the Salt Wells Geothermal Area in 2005.2 This technique was used to measure temperatures at...

  1. Self-referencing remote optical probe

    DOE Patents [OSTI]

    O'Rourke, Patrick E. (157 Greenwood Dr., Martinez, GA 30907); Prather, William S. (2419 Dickey Rd., Augusta, GA 30906); Livingston, Ronald R. (137 Breckenridge Dr., N. Augusta, GA)

    1991-01-01

    A probe for remote spectrometric measurements of fluid samples having a hollow probe body with a sliding reflective plug therein and a lens at one end, ports for admitting and expelling the fluid sample and a means for moving the reflector so that reference measurement can be made with the reflector in a first position near the lens and a sample measurement can be made with the reflector away from the lens and the fluid sample between the reflector and the lens. Comparison of the two measurements will yield the composition of the fluid sample. The probe is preferably used for remote measurements and light is carried to and from the probe via fiber optic cables.

  2. Self-referencing remote optical probe

    DOE Patents [OSTI]

    O'Rourke, P.E.; Prather, W.S.; Livingston, R.R.

    1991-08-13

    A probe is described for remote spectrometric measurements of fluid samples having a hollow probe body with a sliding reflective plug therein and a lens at one end, ports for admitting and expelling the fluid sample and a means for moving the reflector so that reference measurement can be made with the reflector in a first position near the lens and a sample measurement can be made with the reflector away from the lens and the fluid sample between the reflector and the lens. Comparison of the two measurements will yield the composition of the fluid sample. The probe is preferably used for remote measurements and light is carried to and from the probe via fiber optic cables. 3 figures.

  3. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray...

  4. Probing Organic Transistors with Infrared Beams

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Organic Transistors with Infrared Beams Probing Organic Transistors with Infrared Beams Print Wednesday, 26 July 2006 00:00 Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is growing need for the development of electronic devices based on organic polymer materials. Organic field-effect transistors (FETs) are ideal for special applications that require large areas, light weight, and structural flexibility. They also

  5. IBM Probes Material Capabilities at the ALS

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    IBM Probes Material Capabilities at the ALS IBM Probes Material Capabilities at the ALS Print Wednesday, 12 February 2014 11:05 Vanadium dioxide, one of the few known materials that acts like an insulator at low temperatures but like a metal at warmer temperatures, is a somewhat futuristic material that could yield faster and much more energy-efficient electronic devices. Researchers from IBM's forward-thinking Spintronic Science and Applications Center (SpinAps) recently used the ALS to gain

  6. Lightning strokes can probe the ionosphere

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lightning Strokes Can Probe Ionosphere Lightning strokes can probe the ionosphere Researchers have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. April 11, 2013 Lightning. Credit: National Oceanic and Atmospheric Administration (NOAA) The team found that the electron density in the lower ionosphere decreased in response to lightning discharges. Thunderstorms, and the resulting partially ionized plasma of the ionosphere,

  7. Lightning strokes can probe the ionosphere

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lightning Strokes Can Probe Ionosphere Lightning strokes can probe the ionosphere Researchers have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. April 11, 2013 Lightning. Credit: National Oceanic and Atmospheric Administration (NOAA) The team found that the electron density in the lower ionosphere decreased in response to lightning discharges. Thunderstorms, and the resulting partially ionized plasma of the ionosphere,

  8. IBM Probes Material Capabilities at the ALS

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    IBM Probes Material Capabilities at the ALS IBM Probes Material Capabilities at the ALS Print Wednesday, 12 February 2014 11:05 Vanadium dioxide, one of the few known materials that acts like an insulator at low temperatures but like a metal at warmer temperatures, is a somewhat futuristic material that could yield faster and much more energy-efficient electronic devices. Researchers from IBM's forward-thinking Spintronic Science and Applications Center (SpinAps) recently used the ALS to gain

  9. Ultra-high Resolution Electron Microscopy for Catalyst Characterization |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy high Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization 2009 DOE Hydrogen Program and Vehicle Technologies Program Annual Merit Review and Peer Evaluation Meeting, May 18-22, 2009 -- Washington D.C. PDF icon pmp_24_allard.pdf More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-High Resolution Electron Microscopy for Catalyst

  10. Direct Probing of Charge Injection and Polarization-Controlled Ionic Mobility on Ferroelectric LiNbO3 Surfaces

    SciTech Connect (OSTI)

    Strelcov, Evgheni; Ievlev, Dr. Anton; Jesse, Stephen; Kravchenko, Ivan I; Shur, V.Y.; Kalinin, Sergei V

    2014-01-01

    Mapping surface potential with time-resolved Kelvin Probe Force Microscopy (tr-KPFM) in LiNbO3 periodically-poled single crystal revealed activation of the surface ionic subsystem. Electric fields higher than certain threshold value but lower than the switching field induce injection of charge from the biased electrode, formation of an active region in its vicinity and uneven distribution of screening charge on the opposite ferroelectric domains. Tr-KPFM technique allows investigating these phenomena in details.

  11. Fiber optic probe for light scattering measurements

    DOE Patents [OSTI]

    Nave, Stanley E. (Evans, GA); Livingston, Ronald R. (Aiken, SC); Prather, William S. (Augusta, GA)

    1995-01-01

    A fiber optic probe and a method for using the probe for light scattering analyses of a sample. The probe includes a probe body with an inlet for admitting a sample into an interior sample chamber, a first optical fiber for transmitting light from a source into the chamber, and a second optical fiber for transmitting light to a detector such as a spectrophotometer. The interior surface of the probe carries a coating that substantially prevents non-scattered light from reaching the second fiber. The probe is placed in a region where the presence and concentration of an analyte of interest are to be detected, and a sample is admitted into the chamber. Exciting light is transmitted into the sample chamber by the first fiber, where the light interacts with the sample to produce Raman-scattered light. At least some of the Raman-scattered light is received by the second fiber and transmitted to the detector for analysis. Two Raman spectra are measured, at different pressures. The first spectrum is subtracted from the second to remove background effects, and the resulting sample Raman spectrum is compared to a set of stored library spectra to determine the presence and concentration of the analyte.

  12. Fiber optic probe for light scattering measurements

    DOE Patents [OSTI]

    Nave, S.E.; Livingston, R.R.; Prather, W.S.

    1993-01-01

    This invention is comprised of a fiber optic probe and a method for using the probe for light scattering analyses of a sample. The probe includes a probe body with an inlet for admitting a sample into an interior sample chamber, a first optical fiber for transmitting light from a source into the chamber, and a second optical fiber for transmitting light to a detector such as a spectrophotometer. The interior surface of the probe carries a coating that substantially prevents non-scattered light from reaching the second fiber. The probe is placed in a region where the presence and concentration of an analyte of interest are to be detected, and a sample is admitted into the chamber. Exciting light is transmitted into the sample chamber by the first fiber, where the light interacts with the sample to produce Raman-scattered light. At least some of the Raman- scattered light is received by the second fiber and transmitted to the detector for analysis. Two Raman spectra are measured, at different pressures. The first spectrum is subtracted from the second to remove background effects, and the resulting sample Raman spectrum is compared to a set of stored library spectra to determine the presence and concentration of the analyte.

  13. Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint

    SciTech Connect (OSTI)

    Gorman, B. P.; Guthrey, H.; Norman, A. G.; Al-Jassim, M.; Lawrence, D.; Prosa, T.

    2011-07-01

    Internal interfaces are critical in determining the performance of III-V multijunction solar cells. Studying these interfaces with atomic resolution using a combination of transmission electron microscopy (TEM), atom probe tomography (APT), and density functional calculations enables a more fundamental understanding of carrier dynamics in photovoltaic (PV) device structures. To achieve full atomic scale spatial and chemical resolution, data acquisition parameters in laser pulsed APT must be carefully studied to eliminate surface diffusion. Atom probe data with minimized group V ion clustering and expected stoichiometry can be achieved by adjusting laser pulse power, pulse repetition rate, and specimen preparation parameters such that heat flow away from the evaporating surface is maximized. Applying these improved analysis conditions to III-V based PV gives an atomic scale understanding of compositional and dopant profiles across interfaces and tunnel junctions and the initial stages of alloy clustering and dopant accumulation. Details on APT experimental methods and future in-situ instrumentation developments are illustrated.

  14. Circular zig-zag scan video format

    DOE Patents [OSTI]

    Peterson, C.G.; Simmons, C.M.

    1992-06-09

    A circular, ziz-zag scan for use with vidicon tubes is disclosed. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal. 10 figs.

  15. Copy of Bound Original For Scanning

    Office of Legacy Management (LM)

    Copy of Bound Original For Scanning Document # 1\1\ i g -b DOE/El/-0005/6 Formerly Utilized IVIEWAEC Site! Remedial Action Progrhn, F@diilogical Survey of the Seaway Industrial Par Tonawanda, New Yor May 197 Final Repel Prepared f U.S. Department of Enerc Assistant Secretary for Environme Division of Environmental Control Technolo Washington, D.C. 205, uric Contract No. W-7405-ENG- - - - Available from: ' : -. National Technical Information Service (NTIS) U.S. Department of Comnerce 5285 Port

  16. The development of optical microscopy techniques for the advancement of single-particle studies

    SciTech Connect (OSTI)

    Marchuk, Kyle

    2013-05-15

    Single particle orientation and rotational tracking (SPORT) has recently become a powerful optical microscopy tool that can expose many molecular motions. Unfortunately, there is not yet a single microscopy technique that can decipher all particle motions in all environmental conditions, thus there are limitations to current technologies. Within, the two powerful microscopy tools of total internal reflection and interferometry are advanced to determine the position, orientation, and optical properties of metallic nanoparticles in a variety of environments. Total internal reflection is an optical phenomenon that has been applied to microscopy to produce either fluorescent or scattered light. The non-invasive far-field imaging technique is coupled with a near-field illumination scheme that allows for better axial resolution than confocal microscopy and epi-fluorescence microscopy. By controlling the incident illumination angle using total internal reflection fluorescence (TIRF) microscopy, a new type of imaging probe called non-blinking quantum dots (NBQDs) were super-localized in the axial direction to sub-10-nm precision. These particles were also used to study the rotational motion of microtubules being propelled by the motor protein kinesin across the substrate surface. The same instrument was modified to function under total internal reflection scattering (TIRS) microscopy to study metallic anisotropic nanoparticles and their dynamic interactions with synthetic lipid bilayers. Utilizing two illumination lasers with opposite polarization directions at wavelengths corresponding to the short and long axis surface plasmon resonance (SPR) of the nanoparticles, both the in-plane and out-of-plane movements of many particles could be tracked simultaneously. When combined with Gaussian point spread function (PSF) fitting for particle super-localization, the binding status and rotational movement could be resolved without degeneracy. TIRS microscopy was also used to find the 3D orientation of stationary metallic anisotropic nanoparticles utilizing only long-axis SPR enhancement. The polarization direction of the illuminating light was rotated causing the relative intensity of p-polarized and s-polarized light within the evanescent field to change. The interaction of the evanescent field with the particles is dependent on the orientation of the particle producing an intensity curve. This curve and the in-plane angle can be compared with simulations to accurately determine the 3D orientation. Differential interference contrast (DIC) microscopy is another non-invasive far-field technique based upon interferometry that does not rely on staining or other contrast enhancing techniques. In addition, high numerical aperture condensers and objectives can be used to give a very narrow depth of field allowing for the optical tomography of samples, which makes it an ideal candidate to study biological systems. DIC microscopy has also proven itself in determining the orientation of gold nanorods in both engineered environments and within cells. Many types of nanoparticles and nanostructures have been synthesized using lithographic techniques on silicon wafer substrates. Traditionally, reflective mode DIC microscopes have been developed and applied to the topographical study of reflective substrates and the imaging of chips on silicon wafers. Herein, a laser-illuminated reflected-mode DIC was developed for studying nanoparticles on reflective surfaces.

  17. Imaging doped silicon test structures using low energy electron microscopy.

    SciTech Connect (OSTI)

    Nakakura, Craig Yoshimi; Anderson, Meredith Lynn; Kellogg, Gary Lee

    2010-01-01

    This document is the final SAND Report for the LDRD Project 105877 - 'Novel Diagnostic for Advanced Measurements of Semiconductor Devices Exposed to Adverse Environments' - funded through the Nanoscience to Microsystems investment area. Along with the continuous decrease in the feature size of semiconductor device structures comes a growing need for inspection tools with high spatial resolution and high sample throughput. Ideally, such tools should be able to characterize both the surface morphology and local conductivity associated with the structures. The imaging capabilities and wide availability of scanning electron microscopes (SEMs) make them an obvious choice for imaging device structures. Dopant contrast from pn junctions using secondary electrons in the SEM was first reported in 1967 and more recently starting in the mid-1990s. However, the serial acquisition process associated with scanning techniques places limits on the sample throughput. Significantly improved throughput is possible with the use of a parallel imaging scheme such as that found in photoelectron emission microscopy (PEEM) and low energy electron microscopy (LEEM). The application of PEEM and LEEM to device structures relies on contrast mechanisms that distinguish differences in dopant type and concentration. Interestingly, one of the first applications of PEEM was a study of the doping of semiconductors, which showed that the PEEM contrast was very sensitive to the doping level and that dopant concentrations as low as 10{sup 16} cm{sup -3} could be detected. More recent PEEM investigations of Schottky contacts were reported in the late 1990s by Giesen et al., followed by a series of papers in the early 2000s addressing doping contrast in PEEM by Ballarotto and co-workers and Frank and co-workers. In contrast to PEEM, comparatively little has been done to identify contrast mechanisms and assess the capabilities of LEEM for imaging semiconductor device strictures. The one exception is the work of Mankos et al., who evaluated the impact of high-throughput requirements on the LEEM designs and demonstrated new applications of imaging modes with a tilted electron beam. To assess its potential as a semiconductor device imaging tool and to identify contrast mechanisms, we used LEEM to investigate doped Si test structures. In section 2, Imaging Oxide-Covered Doped Si Structures Using LEEM, we show that the LEEM technique is able to provide reasonably high contrast images across lateral pn junctions. The observed contrast is attributed to a work function difference ({Delta}{phi}) between the p- and n-type regions. However, because the doped regions were buried under a thermal oxide ({approx}3.5 nm thick), e-beam charging during imaging prevented quantitative measurements of {Delta}{phi}. As part of this project, we also investigated a series of similar test structures in which the thermal oxide was removed by a chemical etch. With the oxide removed, we obtained intensity-versus-voltage (I-V) curves through the transition from mirror to LEEM mode and determined the relative positions of the vacuum cutoffs for the differently doped regions. Although the details are not discussed in this report, the relative position in voltage of the vacuum cutoffs are a direct measure of the work function difference ({Delta}{phi}) between the p- and n-doped regions.

  18. Direct probing of electron and hole trapping into nano-floating-gate in organic field-effect transistor nonvolatile memories

    SciTech Connect (OSTI)

    Cui, Ze-Qun; Wang, Shun; Chen, Jian-Mei; Gao, Xu; Dong, Bin E-mail: chilf@suda.edu.cn Chi, Li-Feng E-mail: chilf@suda.edu.cn Wang, Sui-Dong E-mail: chilf@suda.edu.cn

    2015-03-23

    Electron and hole trapping into the nano-floating-gate of a pentacene-based organic field-effect transistor nonvolatile memory is directly probed by Kelvin probe force microscopy. The probing is straightforward and non-destructive. The measured surface potential change can quantitatively profile the charge trapping, and the surface characterization results are in good accord with the corresponding device behavior. Both electrons and holes can be trapped into the nano-floating-gate, with a preference of electron trapping than hole trapping. The trapped charge quantity has an approximately linear relation with the programming/erasing gate bias, indicating that the charge trapping in the device is a field-controlled process.

  19. TITLE AUTHORS SUBJECT SUBJECT RELATED DESCRIPTION PUBLISHER AVAILABILI...

    Office of Scientific and Technical Information (OSTI)

    to cross section commercial scale battery electrodes the demonstration of scanning transmission x ray microscopy STXM to probe lithium transport mechanisms within Li ion battery...

  20. The Science of Battery Degradation. Sullivan, John P; Fenton...

    Office of Scientific and Technical Information (OSTI)

    to cross-section commercial scale battery electrodes, the demonstration of scanning transmission x-ray microscopy (STXM) to probe lithium transport mechanisms within Li-ion battery...

  1. Obama Administration Honors Department of Energy Scientists and...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    ... especially strongly correlated and f-electron systems, and the elucidation of ... For extraordinary insights into scanning probe microscopy principles and applying them to ...

  2. Search for: All records | DOE Patents

    Office of Scientific and Technical Information (OSTI)

    Band excitation method applicable to scanning probe microscopy Jesse, Stephen ; Kalinin, Sergei V ... electrically-conductive layers, the electron transport behavior of the ...

  3. V-119: IBM Security AppScan Enterprise Multiple Vulnerabilities...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    9: IBM Security AppScan Enterprise Multiple Vulnerabilities V-119: IBM Security AppScan Enterprise Multiple Vulnerabilities March 26, 2013 - 12:56am Addthis PROBLEM: IBM Security...

  4. REC ScanWafer AS | Open Energy Information

    Open Energy Info (EERE)

    ScanWafer AS Jump to: navigation, search Name: REC ScanWafer AS Place: Hovik, Norway Zip: 1323 Product: Norwegian manufacturer of multicrystalline wafers. Coordinates: 58.002571,...

  5. Scanned_Joint_Declaration_(English).pdf | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    English).pdf ScannedJointDeclaration(English).pdf PDF icon ScannedJointDeclaration(English).pdf More Documents & Publications Joint Statement by Energy Ministers of G8, The ...

  6. Achieving atomic resolution magnetic dichroism by controlling the phase symmetry of an electron probe

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Rusz, Jan; Idrobo, Juan -Carlos; Bhowmick, Somnath

    2014-09-30

    The calculations presented here reveal that an electron probe carrying orbital angular momentum is just a particular case of a wider class of electron beams that can be used to measure electron magnetic circular dichroism (EMCD) with atomic resolution. It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning transmission electron microscope. The probe’s required phase distribution depends on the sample’s magnetic symmetry and crystal structure. The calculations indicate that EMCD signals that use the electron probe’s phase are as strongmore » as those obtained by nanodiffraction methods.« less

  7. Time-stretch microscopy based on time-wavelength sequence reconstruction from wideband incoherent source

    SciTech Connect (OSTI)

    Zhang, Chi Xu, Yiqing; Wei, Xiaoming; Tsia, Kevin K.; Wong, Kenneth K. Y.

    2014-07-28

    Time-stretch microscopy has emerged as an ultrafast optical imaging concept offering the unprecedented combination of the imaging speed and sensitivity. However, dedicated wideband and coherence optical pulse source with high shot-to-shot stability has been mandated for time-wavelength mappingthe enabling process for ultrahigh speed wavelength-encoded image retrieval. From the practical point of view, exploiting methods to relax the stringent requirements (e.g., temporal stability and coherence) for the source of time-stretch microscopy is thus of great value. In this paper, we demonstrated time-stretch microscopy by reconstructing the time-wavelength mapping sequence from a wideband incoherent source. Utilizing the time-lens focusing mechanism mediated by a narrow-band pulse source, this approach allows generation of a wideband incoherent source, with the spectral efficiency enhanced by a factor of 18. As a proof-of-principle demonstration, time-stretch imaging with the scan rate as high as MHz and diffraction-limited resolution is achieved based on the wideband incoherent source. We note that the concept of time-wavelength sequence reconstruction from wideband incoherent source can also be generalized to any high-speed optical real-time measurements, where wavelength is acted as the information carrier.

  8. Rapid scanning system for fuel drawers

    DOE Patents [OSTI]

    Caldwell, J.T.; Fehlau, P.E.; France, S.W.

    A nondestructive method for uniquely distinguishing among and quantifying the mass of individual fuel plates in situ in fuel drawers utilized in nuclear reactors is described. The method is both rapid and passive, eliminating the personnel hazard of the commonly used irradiation techniques which require that the analysis be performed in proximity to an intense neutron source such as a reactor. In the present technique, only normally decaying nuclei are observed. This allows the analysis to be performed anywhere. This feature, combined with rapid scanning of a given fuel drawer (in approximately 30 s), and the computer data analysis allows the processing of large numbers of fuel drawers efficiently in the event of a loss alert.

  9. Rapid scanning system for fuel drawers

    DOE Patents [OSTI]

    Caldwell, John T. (Los Alamos, NM); Fehlau, Paul E. (Los Alamos, NM); France, Stephen W. (Los Alamos, NM)

    1981-01-01

    A nondestructive method for uniqely distinguishing among and quantifying the mass of individual fuel plates in situ in fuel drawers utilized in nuclear reactors is described. The method is both rapid and passive, eliminating the personnel hazard of the commonly used irradiation techniques which require that the analysis be performed in proximity to an intense neutron source such as a reactor. In the present technique, only normally decaying nuclei are observed. This allows the analysis to be performed anywhere. This feature, combined with rapid scanning of a given fuel drawer (in approximately 30 s), and the computer data analysis allows the processing of large numbers of fuel drawers efficiently in the event of a loss alert.

  10. Scanning systems for particle cancer therapy

    DOE Patents [OSTI]

    Trbojevic, Dejan

    2015-08-04

    A particle beam to treat malignant tissue is delivered to a patient by a gantry. The gantry includes a plurality of small magnets sequentially arranged along a beam tube to transfer the particle beam with strong focusing and a small dispersion function, whereby a beam size is very small, allowing for the small magnet size. Magnets arranged along the beam tube uses combined function magnets where the magnetic field is a combination of a bending dipole field with a focusing or defocusing quadrupole field. A triplet set of combined function magnets defines the beam size at the patient. A scanning system of magnets arranged along the beam tube after the bending system delivers the particle beam in a direction normal to the patient, to minimize healthy skin and tissue exposure to the particle beam.

  11. Gamma-ray blind beta particle probe

    DOE Patents [OSTI]

    Weisenberger, Andrew G. (Grafton, VA)

    2001-01-01

    An intra-operative beta particle probe is provided by placing a suitable photomultiplier tube (PMT), micro channel plate (MCP) or other electron multiplier device within a vacuum housing equipped with: 1) an appropriate beta particle permeable window; and 2) electron detection circuitry. Beta particles emitted in the immediate vicinity of the probe window will be received by the electron multiplier device and amplified to produce a detectable signal. Such a device is useful as a gamma insensitive, intra-operative, beta particle probe in surgeries where the patient has been injected with a beta emitting radiopharmaceutical. The method of use of such a device is also described, as is a position sensitive such device.

  12. Remote adjustable focus Raman spectroscopy probe

    DOE Patents [OSTI]

    Schmucker, John E.; Blasi, Raymond J.; Archer, William B.

    1999-01-01

    A remote adjustable focus Raman spectroscopy probe allows for analyzing Raman scattered light from a point of interest external probe. An environmental barrier including at least one window separates the probe from the point of interest. An optical tube is disposed adjacent to the environmental barrier and includes a long working length compound lens objective next to the window. A beam splitter and a mirror are at the other end. A mechanical means is used to translated the prove body in the X, Y, and Z directions resulting in a variable focus optical apparatus. Laser light is reflected by the beam splitter and directed toward the compound lens objective, then through the window and focused on the point of interest. Raman scattered light is then collected by the compound lens objective and directed through the beam splitter to a mirror. A device for analyzing the light, such as a monochrometer, is coupled to the mirror.

  13. Study of Martensitic Phase transformation in a NiTiCu Thin Film Shape Memory Alloy Using Photoelectron Emission Microscopy

    SciTech Connect (OSTI)

    Cai, Mingdong; Langford, Stephen C.; Wu, Maggie J.; Huang, W. M.; Xiong, Gang; Droubay, Timothy C.; Joly, Alan G.; Beck, Kenneth; Hess, Wayne P.; Dickinson, J. T.

    2007-01-01

    The thermally-induced martensitic phase transformation in a polycrystalline NiTiCu thin film shape memory alloy was probed by photoelectron emission microscopy (PEEM). In situ PEEM images reveal distinct changes in microstructure and photoemission intensity at the phase transition temperatures. In particular, images of the low temperature, martensite phase are brighter than that of the high temperature, austenite phase, due to the relatively lower work function of the martensite. Ultra-violet photoelectron spectroscopy shows that the effective work function changes by about 0.16 eV during thermal cycling. In situ PEEM images also show that the network of trenches observed on the room temperature film disappear suddenly during heating and reappear suddenly during subsequent cooling. These trenches are also characterized by atomic force microscopy at selected temperatures. We describe implications of these observations with respect to the spatial distribution of phases during thermal cycling in this thin film shape memory alloy.

  14. Scintillation probe with photomultiplier tube saturation indicator

    DOE Patents [OSTI]

    Ruch, Jeffrey F. (Bethel Park, PA); Urban, David J. (Glassport, PA)

    1996-01-01

    A photomultiplier tube saturation indicator is formed by supplying a supplemental light source, typically an light emitting diode (LED), adjacent to the photomultiplier tube. A switch allows the light source to be activated. The light is forwarded to the photomultiplier tube by an optical fiber. If the probe is properly light tight, then a meter attached to the indicator will register the light from the LED. If the probe is no longer light tight, and the saturation indicator is saturated, no signal will be registered when the LED is activated.

  15. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect (OSTI)

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanners fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the ?{sub 3}?{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ?7 frames/s.

  16. Full information acquisition in piezoresponse force microscopy

    SciTech Connect (OSTI)

    Somnath, Suhas; Belianinov, Alex; Jesse, Stephen; Kalinin, Sergei V.

    2015-12-28

    The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.

  17. Full information acquisition in piezoresponse force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Somnath, Suhas; Belianinov, Alex; Jesse, Stephen; Kalinin, Sergei V.

    2015-12-28

    The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separatemore » the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.« less

  18. Stimulation Emission Depletion (STED) microscopy | The Ames Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Stimulation Emission Depletion (STED) microscopy What is STED? Stimulation Emission Depletion (STED) microscopy is a super resolution microscopy tool that captures super resolution images on a nanometer scale. A donut-shaped red light switches off surrounding molecules, allowing only those in the center to fluoresce. At the nanoscale, light microscopes cannot tell features apart. Because light moves as waves and the particles of light are so close together, the lens used cannot focus all of the

  19. In Situ Transmission Electron Microscopy. (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    In Situ Transmission Electron Microscopy. Citation Details In-Document Search Title: In Situ Transmission Electron Microscopy. Abstract not provided. Authors: Jungjohann, Katherine Leigh ; Liu, Yang Publication Date: 2015-02-01 OSTI Identifier: 1238312 Report Number(s): SAND2015-0858C 563495 DOE Contract Number: AC04-94AL85000 Resource Type: Conference Resource Relation: Conference: Proposed for presentation at the Advanced Electron Microscopy (AEM) Workshop held February 11-13, 2015 in San

  20. Electron Microscopy > Analytical Resources > Research > The Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Materials Center at Cornell Analytical Resources In This Section Differential Electrochemical Mass Spectroscopy (DEMS) Electron Microscopy X-Ray Diffraction Electron Microscopy Aberration-Corrected Electron Microscope Facility Electron microscopy provides atomic-resolution images of the structure, composition and bonding of our fuel cells and their components. Three-dimensional images of catalyst particles and their support materials are constructed using electron tomography - a similar

  1. In-Situ Electron Microscopy of Electrical Energy Storage Materials...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials In-situ characterization and diagnostics of mechanical degradation in electrodes...

  2. "A Novel Objective for EUV Microscopy and EUV Lithography" Inventors...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Novel Objective for EUV Microscopy and EUV Lithography" Inventors ..--.. Manfred Bitter, Kenneth Hill, Philip Efthimion. This invention is a new x-ray scheme for stigmatic...

  3. In situ transmission electron microscopy investigation of the...

    Office of Scientific and Technical Information (OSTI)

    In situ transmission electron microscopy investigation of the interfacial reaction between Ni and Al during rapid heating in a nanocalorimeter Grapes, Michael D. Department of...

  4. In situ transmission electron microscopy investigation of the...

    Office of Scientific and Technical Information (OSTI)

    Published Article: In situ transmission electron microscopy investigation of the interfacial reaction between Ni and Al during rapid heating in a nanocalorimeter Title: In situ...

  5. X-Ray Microscopy Reveals How Crystal Mechanics Drive Battery...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopy Reveals How Crystal Mechanics Drive Battery Performance Print Rechargeable lithium-ion batteries power most portable electronics and are becoming more widely used in...

  6. X-Ray Diffraction Microscopy of Magnetic Structures (Journal...

    Office of Scientific and Technical Information (OSTI)

    Prev Next Title: X-Ray Diffraction Microscopy of Magnetic Structures Authors: Turner, Joshua J. ; Huang, Xiaojing ; Krupin, Oleg ; Seu, Keoki A. ; Parks, Daniel ; Kevan,...

  7. Probe and method for DNA detection

    DOE Patents [OSTI]

    Yeh, Hsin-Chih; Werner, James Henry; Sharma, Jaswinder Kumar; Martinez, Jennifer Suzanne

    2013-07-02

    A hybridization probe containing two linear strands of DNA lights up upon hybridization to a target DNA using silver nanoclusters that have been templated onto one of the DNA strands. Hybridization induces proximity between the nanoclusters on one strand and an overhang on the other strand, which results in enhanced fluorescence emission from the nanoclusters.

  8. Systems and methods for selective detection and imaging in coherent Raman microscopy by spectral excitation shaping

    DOE Patents [OSTI]

    Xie, Xiaoliang Sunney; Freudiger, Christian; Min, Wei

    2016-03-15

    A microscopy imaging system is disclosed that includes a light source system, a spectral shaper, a modulator system, an optics system, an optical detector and a processor. The light source system is for providing a first train of pulses and a second train of pulses. The spectral shaper is for spectrally modifying an optical property of at least some frequency components of the broadband range of frequency components such that the broadband range of frequency components is shaped producing a shaped first train of pulses to specifically probe a spectral feature of interest from a sample, and to reduce information from features that are not of interest from the sample. The modulator system is for modulating a property of at least one of the shaped first train of pulses and the second train of pulses at a modulation frequency. The optical detector is for detecting an integrated intensity of substantially all optical frequency components of a train of pulses of interest transmitted or reflected through the common focal volume. The processor is for detecting a modulation at the modulation frequency of the integrated intensity of substantially all of the optical frequency components of the train of pulses of interest due to the non-linear interaction of the shaped first train of pulses with the second train of pulses as modulated in the common focal volume, and for providing an output signal for a pixel of an image for the microscopy imaging system.

  9. A TRANSMISSION ELECTRON MICROSCOPY STUDY OF PRESOLAR HIBONITE

    SciTech Connect (OSTI)

    Zega, Thomas J.; Stroud, Rhonda M.; Alexander, Conel M. O'D.; Nittler, Larry R.

    2011-04-01

    We report isotopic and microstructural data on five presolar hibonite grains (KH1, KH2, KH6, KH15, and KH21) identified in an acid residue of the Krymka LL3.1 ordinary chondrite. Isotopic measurements by secondary ion mass spectrometry (SIMS) verified a presolar circumstellar origin for the grains. Transmission electron microscopy (TEM) examination of the crystal structure and chemistry of the grains was enabled by in situ sectioning and lift-out with a focused-ion-beam scanning-electron microscope (FIB-SEM). Comparisons of isotopic compositions with models indicate that four of the five grains formed in low-mass stars that evolved through the red giant/asymptotic giant branches (RGBs/AGBs), whereas one grain formed in the ejecta of a Type II supernova. Selected-area electron-diffraction patterns show that all grains are single crystals of hibonite. Some grains contain minor structural perturbations (stacking faults) and small spreads in orientation that can be attributed to a combination of growth defects and mechanical processing by grain-grain collisions. The similar structure of the supernova grain to those from RGB/AGB stars indicates a similarity in the formation conditions. Radiation damage (e.g., point defects), if present, occurs below our detection limit. Of the five grains we studied, only one has the pure hibonite composition of CaAl{sub 12}O{sub 19}. All others contain minor amounts of Mg, Si, Ti, and Fe. The microstructural data are generally consistent with theoretical predictions, which constrain the circumstellar condensation temperature to a range of 1480-1743 K, assuming a corresponding total gas pressure between 1 x 10{sup -6} and 1 x 10{sup -3} atm. The TEM data were also used to develop a calibration for SIMS determination of Ti contents in oxide grains. Grains with extreme {sup 18}O depletions, indicating deep mixing has occurred in their parent AGB stars, are slightly Ti enriched compared with grains from stars without deep mixing, most likely reflecting differences in grain condensation conditions.

  10. Semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon (Pinole, CA); Bruchez, Marcel (Newark, CA); Alivisatos, Paul (Oakland, CA)

    2011-12-06

    A semiconductor nanocrystal compound and probe are described. The compound is capable of linking to one or more affinity molecules. The compound comprises (1) one or more semiconductor nanocrystals capable of, in response to exposure to a first energy, providing a second energy, and (2) one or more linking agents, having a first portion linked to the one or more semiconductor nanocrystals and a second portion capable of linking to one or more affinity molecules. One or more semiconductor nanocrystal compounds are linked to one or more affinity molecules to form a semiconductor nanocrystal probe capable of bonding with one or more detectable substances in a material being analyzed, and capable of, in response to exposure to a first energy, providing a second energy. Also described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and treating materials with the probe.

  11. Semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon (Pinole, CA); Bruchez, Marcel (Newark, CA); Alivisatos, Paul (Oakland, CA)

    2011-12-20

    A semiconductor nanocrystal compound and probe are described. The compound is capable of linking to one or more affinity molecules. The compound comprises (1) one or more semiconductor nanocrystals capable of, in response to exposure to a first energy, providing a second energy, and (2) one or more linking agents, having a first portion linked to the one or more semiconductor nanocrystals and a second portion capable of linking to one or more affinity molecules. One or more semiconductor nanocrystal compounds are linked to one or more affinity molecules to form a semiconductor nanocrystal probe capable of bonding with one or more detectable substances in a material being analyzed, and capable of, in response to exposure to a first energy, providing a second energy. Also described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and treating materials with the probe.

  12. Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon; Bruchez, Jr., Marcel; Alivisatos, Paul

    2006-09-05

    A semiconductor nanocrystal compound is described capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source or a particle beam; and (2) at least one linking agent, having a first portion linked to the semiconductor nanocrystal and a second portion capable of linking to an affinity molecule. The compound is linked to an affinity molecule to form a semiconductor nanocrystal probe capable of bonding with a detectable substance. subsequent exposure to excitation energy will excite the semiconductor nanocrystal in the probe causing the emission of electromagnetic radiation. Further described are processes for respectively: making the luminescent semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and using the probe to determine the presence of a detectable substance in a material.

  13. Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon (Pinole, CA); Bruchez, Jr., Marcel (Albany, CA); Alivisatos, Paul (Oakland, CA)

    2002-01-01

    A semiconductor nanocrystal compound is described capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source or a particle beam; and (2) at least one linking agent, having a first portion linked to the semiconductor nanocrystal and a second portion capable of linking to an affity molecule. The compound is linked to an affinity molecule to form a semiconductor nanocrystal probe capable of bonding with a detectable substance. Subsequent exposure to excitation energy will excite the semiconductor nanocrystal in he probe, causing the emission of electromagnetic radiation. Further described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and using the probe to determine the presence of a detectable substance in a material.

  14. Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon (Pinole, CA); Bruchez, Jr., Marcel (Albany, CA); Alivisatos, Paul (Oakland, CA)

    2004-03-02

    A semiconductor nanocrystal compound is described capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source or a particle beam; and (2) at least one linking agent, having a first portion linked to the semiconductor nanocrystal and a second portion capable of linking to an affinity molecule. The compound is linked to an affinity molecule to form a semiconductor nanocrystal probe capable of bonding with a detectable substance. Subsequent exposure to excitation energy will excite the semiconductor nanocrystal in the probe, causing the emission of electromagnetic radiation. Further described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and using the probe to determine the presence of a detectable substance in a material.

  15. Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon; Bruchez, Jr., Marcel; Alivisatos, Paul

    2005-08-09

    A semiconductor nanocrystal compound is described capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source or a particle beam; and (2) at least one linking agent, having a first portion linked to the semiconductor nanocrystal and a second portion capable of linking to an affinity molecule. The compound is linked to an affinity molecule to form a semiconductor nanocrystal probe capable of bonding with a detectable substance. Subsequent exposure to excitation energy will excite the semiconductor nanocrystal in the probe causing the emission of electromagnetic radiation. Further described are processes for respectively: making the luminescent semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and using the probe to determine the presence of a detectable substance in a material.

  16. Semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon; Bruchez, Marcel; Alivisatos, Paul

    2012-10-16

    A semiconductor nanocrystal compound and probe are described. The compound is capable of linking to one or more affinity molecules. The compound comprises (1) one or more semiconductor nanocrystals capable of, in response to exposure to a first energy, providing a second energy, and (2) one or more linking agents, having a first portion linked to the one or more semiconductor nanocrystals and a second portion capable of linking to one or more affinity molecules. One or more semiconductor nanocrystal compounds are linked to one or more affinity molecules to form a semiconductor nanocrystal probe capable of bonding with one or more detectable substances in a material being analyzed, and capable of, in response to exposure to a first energy, providing a second energy. Also described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and treating materials with the probe.

  17. Semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon; Bruchez, Marcel; Alivisatos, Paul

    2014-01-28

    A semiconductor nanocrystal compound and probe are described. The compound is capable of linking to one or more affinity molecules. The compound comprises (1) one or more semiconductor nanocrystals capable of, in response to exposure to a first energy, providing a second energy, and (2) one or more linking agents, having a first portion linked to the one or more semiconductor nanocrystals and a second portion capable of linking to one or more affinity molecules. One or more semiconductor nanocrystal compounds are linked to one or more affinity molecules to form a semiconductor nanocrystal probe capable of bonding with one or more detectable substances in a material being analyzed, and capable of, in response to exposure to a first energy, providing a second energy. Also described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and treating materials with the probe.

  18. ARM - Evaluation Product - Scanning ARM Cloud Radar Corrections (SACRCOR)

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ProductsScanning ARM Cloud Radar Corrections (SACRCOR) ARM Data Discovery Browse Data Documentation Use the Data File Inventory tool to view data availability at the file level. Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Evaluation Product : Scanning ARM Cloud Radar Corrections (SACRCOR) [ ARM research - evaluation data product ] This dataset contains moments from the Scanning ARM Cloud Radars (SACRs) which have been filtered and corrected

  19. In-Situ Electron Microscopy of Electrical Energy Storage Materials |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy 2 DOE Hydrogen and Fuel Cells Program and Vehicle Technologies Program Annual Merit Review and Peer Evaluation Meeting PDF icon es095_unocic_2012_p.pdf More Documents & Publications In-Situ Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials Investigations of electrode interface and architecture

  20. Combining Quantitative Electrochemistry and Electron Microscopy to Study

    Office of Scientific and Technical Information (OSTI)

    Reversible Lithiation of Silicon Nanowires. (Conference) | SciTech Connect Combining Quantitative Electrochemistry and Electron Microscopy to Study Reversible Lithiation of Silicon Nanowires. Citation Details In-Document Search Title: Combining Quantitative Electrochemistry and Electron Microscopy to Study Reversible Lithiation of Silicon Nanowires. Authors: Zavadil, Kevin R. ; Liu, Yang ; Harris, Charles Thomas ; Sullivan, John P. [1] + Show Author Affiliations (Sandia National

  1. Ultra-High Resolution Electron Microscopy for Catalyst Characterization |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy 1 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies Program Annual Merit Review and Peer Evaluation PDF icon pm029_allard_2011_p.pdf More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization Catalyst Characterization

  2. Direct Probe of Interplay between Local Structure and Superconductivit...

    Office of Scientific and Technical Information (OSTI)

    Direct Probe of Interplay between Local Structure and Superconductivity in FeTe0.55Se0.45 Citation Details In-Document Search Title: Direct Probe of Interplay between Local...

  3. Probing Core-Hole Localization in Molecular Nitrogen

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Core-Hole Localization in Molecular Nitrogen Probing Core-Hole Localization in Molecular Nitrogen Print Wednesday, 25 February 2009 00:00 The behavior of the core hole...

  4. Surface enhanced Raman gene probe and methods thereof

    DOE Patents [OSTI]

    Vo-Dinh, Tuan (Knoxville, TN)

    1998-01-01

    The subject invention disclosed herein is a new gene probe biosensor and methods thereof based on surface enhanced Raman scattering (SERS) label detection. The SER gene probe biosensor comprises a support means, a SER gene probe having at least one oligonucleotide strand labeled with at least one SERS label, and a SERS active substrate disposed on the support means and having at least one of the SER gene probes adsorbed thereon. Biotargets such as bacterial and viral DNA, RNA and PNA are detected using a SER gene probe via hybridization to oligonucleotide strands complementary to the SER gene probe. The support means supporting the SERS active substrate includes a fiberoptic probe, an array of fiberoptic probes for performance of multiple assays and a waveguide microsensor array with charge-coupled devices or photodiode arrays.

  5. Surface enhanced Raman gene probe and methods thereof

    DOE Patents [OSTI]

    Vo-Dinh, T.

    1998-09-29

    The subject invention disclosed herein is a new gene probe biosensor and methods based on surface enhanced Raman scattering (SERS) label detection. The SER gene probe biosensor comprises a support means, a SER gene probe having at least one oligonucleotide strand labeled with at least one SERS label, and a SERS active substrate disposed on the support means and having at least one of the SER gene probes adsorbed thereon. Biotargets such as bacterial and viral DNA, RNA and PNA are detected using a SER gene probe via hybridization to oligonucleotide strands complementary to the SER gene probe. The support means supporting the SERS active substrate includes a fiberoptic probe, an array of fiberoptic probes for performance of multiple assays and a waveguide microsensor array with charge-coupled devices or photodiode arrays. 18 figs.

  6. Surface enhanced Raman gene probe and methods thereof

    DOE Patents [OSTI]

    Vo-Dinh, T.

    1998-07-21

    The subject invention disclosed is a new gene probe biosensor and methods based on surface enhanced Raman scattering (SERS) label detection. The SER gene probe biosensor comprises a support means, a SER gene probe having at least one oligonucleotide strand labeled with at least one SERS label, and a SERS active substrate disposed on the support means and having at least one of the SER gene probes adsorbed. Biotargets such as bacterial and viral DNA, RNA and PNA are detected using a SER gene probe via hybridization to oligonucleotide strands complementary to the SER gene probe. The support means supporting the SERS active substrate includes a fiberoptic probe, an array of fiberoptic probes for performance of multiple assays and a waveguide microsensor array with charge-coupled devices or photodiode arrays. 18 figs.

  7. Surface enhanced Raman gene probe and methods thereof

    DOE Patents [OSTI]

    Vo-Dinh, T.

    1998-02-24

    The subject invention disclosed is a new gene probe biosensor and methods based on surface enhanced Raman scattering (SERS) label detection. The SER gene probe biosensor comprises a support means, a SER gene probe having at least one oligonucleotide strand labeled with at least one SERS label, and a SERS active substrate disposed on the support means and having at least one of the SER gene probes adsorbed thereon. Biotargets such as bacterial and viral DNA, RNA and PNA are detected using a SER gene probe via hybridization to oligonucleotide strands complementary to the SER gene probe. The support means includes a fiberoptic probe, an array of fiberoptic probes for performance of multiple assays and a waveguide microsensor array with charge-coupled devices or photodiode arrays. 18 figs.

  8. Lens-array PDV Probe Using a Pyramid Prism

    SciTech Connect (OSTI)

    Malone, R. M., Kaufman, M. I., Cox, B., Romero, V., Cata B., Sorenson, D. Pazuchanics, P.

    2011-11-01

    A bug eye probe is shown using a pyramid prism, and its advantages and disadvantages are enumerated. Also shown is abug eye imaging probe, with its advantages and disadvantages enumerated.

  9. Neutron Beta Decay as a Probe of Weak Interactions (Conference...

    Office of Scientific and Technical Information (OSTI)

    Conference: Neutron Beta Decay as a Probe of Weak Interactions Citation Details In-Document Search Title: Neutron Beta Decay as a Probe of Weak Interactions You are accessing a...

  10. Multi-level scanning method for defect inspection

    DOE Patents [OSTI]

    Bokor, Jeffrey (Oakland, CA); Jeong, Seongtae (Richmond, CA)

    2002-01-01

    A method for performing scanned defect inspection of a collection of contiguous areas using a specified false-alarm-rate and capture-rate within an inspection system that has characteristic seek times between inspection locations. The multi-stage method involves setting an increased false-alarm-rate for a first stage of scanning, wherein subsequent stages of scanning inspect only the detected areas of probable defects at lowered values for the false-alarm-rate. For scanning inspection operations wherein the seek time and area uncertainty is favorable, the method can substantially increase inspection throughput.

  11. Demonstration of scan path optimization in proton therapy

    SciTech Connect (OSTI)

    Kang, Joanne H.; Wilkens, Jan J.; Oelfke, Uwe

    2007-09-15

    A three-dimensional (3D) intensity modulated proton therapy treatment plan to be delivered by magnetic scanning may comprise thousands of discrete beam positions. This research presents the minimization of the total scan path length by application of a fast simulated annealing (FSA) optimization algorithm. Treatment plans for clinical prostate and head and neck cases were sequenced for continuous raster scanning in two ways, and the resulting scan path lengths were compared: (1) A simple back-and-forth, top-to-bottom (zigzag) succession, and (2) an optimized path produced as a solution of the FSA algorithm. Using a first approximation of the scanning dynamics, the delivery times for the scan sequences before and after path optimization were calculated for comparison. In these clinical examples, the FSA optimization shortened the total scan path length for the 3D target volumes by approximately 13%-56%. The number of extraneous spilled particles was correspondingly reduced by about 13%-54% due to the more efficient scanning maps that eliminated multiple crossings through regions of zero fluence. The relative decrease in delivery time due to path length minimization was estimated to be less than 1%, due to both a high scanning speed and time requirements that could not be altered by optimization (e.g., time required to change the beam energy). In a preliminary consideration of application to rescanning techniques, the decrease in delivery time was estimated to be 4%-20%.

  12. System Provides Clear Brain Scans of Awake, Unrestrained Mice...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    System Provides Clear Brain Scans of Awake, Unrestrained Mice dynamic imaging of mice ... obtain detailed, functional images of the brain of a conscious mouse as it moves around. ...

  13. Near-field microwave microscopy of high-? oxides grown on graphene with an organic seeding layer

    SciTech Connect (OSTI)

    Tselev, Alexander Kalinin, Sergei V.; Sangwan, Vinod K.; Jariwala, Deep; Lauhon, Lincoln J.; Marks, Tobin J.; Hersam, Mark C.; Department of Chemistry, Northwestern University, Evanston, Illinois 60208

    2013-12-09

    Near-field scanning microwave microscopy (SMM) is used for non-destructive nanoscale characterization of Al{sub 2}O{sub 3} and HfO{sub 2} films grown on epitaxial graphene on SiC by atomic layer deposition using a self-assembled perylene-3,4,9,10-tetracarboxylic dianhydride seeding layer. SMM allows imaging of buried inhomogeneities in the dielectric layer with a spatial resolution close to 100?nm. The results indicate that, while topographic features on the substrate surface cannot be eliminated as possible sites of defect nucleation, the use of a vertically heterogeneous Al{sub 2}O{sub 3}/HfO{sub 2} stack suppresses formation of large outgrowth defects in the oxide film, ultimately improving lateral uniformity of the dielectric film.

  14. Hetero-epitaxial EuO interfaces studied by analytic electron microscopy

    SciTech Connect (OSTI)

    Mundy, Julia A.; Hodash, Daniel; Melville, Alexander; Held, Rainer; Mairoser, Thomas; Schmehl, Andreas; Muller, David A.; Kourkoutis, Lena F.; Schlom, Darrell G.

    2014-03-03

    With nearly complete spin polarization, the ferromagnetic semiconductor europium monoxide could enable next-generation spintronic devices by providing efficient ohmic spin injection into silicon. Spin injection is greatly affected by the quality of the interface between the injector and silicon. Here, we use atomic-resolution scanning transmission electron microscopy in conjunction with electron energy loss spectroscopy to directly image and chemically characterize a series of EuO|Si and EuO|YAlO{sub 3} interfaces fabricated using different growth conditions. We identify the presence of europium silicides and regions of disorder at the EuO|Si interfaces, imperfections that could significantly reduce spin injection efficiencies via spin-flip scattering.

  15. Test probe for surface mounted leadless chip carrier

    DOE Patents [OSTI]

    Meyer, Kerry L.; Topolewski, John

    1989-05-23

    A test probe for a surface mounted leadless chip carrier is disclosed. The probed includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe.

  16. Hand and shoe monitor using air ionization probes

    DOE Patents [OSTI]

    Fergus, Richard W. (Lombard, IL)

    1981-01-01

    A hand and shoe radiation monitor is provided which includes a probe support body defining a plurality of cells, within each cell there being an ionization probe. The support body provides structural strength for protecting the ionization probes from force applied to the support body during a radiation monitoring event. There is also provided a fast response time amplifier circuit for the output from the ionization probes.

  17. Kit for detecting nucleic acid sequences using competitive hybridization probes

    DOE Patents [OSTI]

    Lucas, Joe N. (San Ramon, CA); Straume, Tore (Tracy, CA); Bogen, Kenneth T. (Walnut Creek, CA)

    2001-01-01

    A kit is provided for detecting a target nucleic acid sequence in a sample, the kit comprising: a first hybridization probe which includes a nucleic acid sequence that is sufficiently complementary to selectively hybridize to a first portion of the target sequence, the first hybridization probe including a first complexing agent for forming a binding pair with a second complexing agent; and a second hybridization probe which includes a nucleic acid sequence that is sufficiently complementary to selectively hybridize to a second portion of the target sequence to which the first hybridization probe does not selectively hybridize, the second hybridization probe including a detectable marker; a third hybridization probe which includes a nucleic acid sequence that is sufficiently complementary to selectively hybridize to a first portion of the target sequence, the third hybridization probe including the same detectable marker as the second hybridization probe; and a fourth hybridization probe which includes a nucleic acid sequence that is sufficiently complementary to selectively hybridize to a second portion of the target sequence to which the third hybridization probe does not selectively hybridize, the fourth hybridization probe including the first complexing agent for forming a binding pair with the second complexing agent; wherein the first and second hybridization probes are capable of simultaneously hybridizing to the target sequence and the third and fourth hybridization probes are capable of simultaneously hybridizing to the target sequence, the detectable marker is not present on the first or fourth hybridization probes and the first, second, third, and fourth hybridization probes each include a competitive nucleic acid sequence which is sufficiently complementary to a third portion of the target sequence that the competitive sequences of the first, second, third, and fourth hybridization probes compete with each other to hybridize to the third portion of the target sequence.

  18. Los Alamos provides HOPE for radiation belt storm probes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    HOPE for radiation belt storm probes Los Alamos provides HOPE for radiation belt storm probes The HOPE analyzer is one of a suite of instruments that was successfully launched as part of the Radiation Belt Storm Probe mission. August 30, 2012 Artist's rendering showing two spacecraft representing the not-yet-designed Radiation Belt Storm Probes that will study the sun and its effects on Earth. PHOTO CREDIT: Johns Hopkins University Applied Physics Laboratory Artist's rendering showing two

  19. Precision Probes of a Leptophobic Z' Boson

    SciTech Connect (OSTI)

    Buckley, Matthew R. [Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States); Ramsey-Musolf, Michael J. [University of Wisconsin, Madison, WI (US); Kellogg Radiation Laboratory, California Institute of Technology, Pasadena, CA (US)

    2012-03-01

    Extensions of the Standard Model that contain leptophobic Z' gauge bosons are theoretically interesting but difficult to probe directly in high-energy hadron colliders. However, precision measurements of Standard Model neutral current processes can provide powerful indirect tests. We demonstrate that parity-violating deep inelastic scattering of polarized electrons off of deuterium offer a unique probe leptophobic Z' bosons with axial quark couplings and masses above 100 GeV. In addition to covering a wide range of previously uncharted parameter space, planned measurements of the deep inelastic parity-violating eD asymmetry would be capable of testing leptophobic Z' scenarios proposed to explain the CDF W plus dijet anomaly.

  20. Transmission X-ray scattering as a probe for complex liquid-surface structures

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Fukuto, Masafumi; Yang, Lin; Nykypanchuk, Dmytro; Kuzmenko, Ivan

    2016-01-28

    The need for functional materials calls for increasing complexity in self-assembly systems. As a result, the ability to probe both local structure and heterogeneities, such as phase-coexistence and domain morphologies, has become increasingly important to controlling self-assembly processes, including those at liquid surfaces. The traditional X-ray scattering methods for liquid surfaces, such as specular reflectivity and grazing-incidence diffraction, are not well suited to spatially resolving lateral heterogeneities due to large illuminated footprint. A possible alternative approach is to use scanning transmission X-ray scattering to simultaneously probe local intermolecular structures and heterogeneous domain morphologies on liquid surfaces. To test the feasibilitymore » of this approach, transmission small- and wide-angle X-ray scattering (TSAXS/TWAXS) studies of Langmuir films formed on water meniscus against a vertically immersed hydrophilic Si substrate were recently carried out. First-order diffraction rings were observed in TSAXS patterns from a monolayer of hexagonally packed gold nanoparticles and in TWAXS patterns from a monolayer of fluorinated fatty acids, both as a Langmuir monolayer on water meniscus and as a Langmuir–Blodgett monolayer on the substrate. The patterns taken at multiple spots have been analyzed to extract the shape of the meniscus surface and the ordered-monolayer coverage as a function of spot position. These results, together with continual improvement in the brightness and spot size of X-ray beams available at synchrotron facilities, support the possibility of using scanning-probe TSAXS/TWAXS to characterize heterogeneous structures at liquid surfaces.« less

  1. Method for replicating an array of nucleic acid probes

    DOE Patents [OSTI]

    Cantor, C.R.; Przetakiewicz, M.; Smith, C.L.; Sano, T.

    1998-08-18

    The invention relates to the replication of probe arrays and methods for replicating arrays of probes which are useful for the large scale manufacture of diagnostic aids used to screen biological samples for specific target sequences. Arrays created using PCR technology may comprise probes with 5{prime}- and/or 3{prime}-overhangs. 16 figs.

  2. Method for replicating an array of nucleic acid probes

    DOE Patents [OSTI]

    Cantor, Charles R. (Boston, MA); Przetakiewicz, Marek (Boston, MA); Smith, Cassandra L. (Boston, MA); Sano, Takeshi (Boston, MA)

    1998-01-01

    The invention relates to the replication of probe arrays and methods for replicating arrays of probes which are useful for the large scale manufacture of diagnostic aids used to screen biological samples for specific target sequences. Arrays created using PCR technology may comprise probes with 5'- and/or 3'-overhangs.

  3. Resistance probe for energetic particle dosimetry

    DOE Patents [OSTI]

    Wampler, William R. (Albuquerque, NM)

    1988-01-01

    A probe for determining the energy and flux of particles in a plasma comprises a carbon film adapted to be exposed to the plasma, the film havinmg an electrical resistance which is related to the number of particles impacting the film, contacts for passing an electrical current through the film, and contacts for determining the electrical resistance of the film. An improved method for determining the energy or flux of particles in a plasma is also disclosed.

  4. Regenerable activated bauxite adsorbent alkali monitor probe

    DOE Patents [OSTI]

    Lee, S.H.D.

    1992-12-22

    A regenerable activated bauxite adsorber alkali monitor probe for field applications to provide reliable measurement of alkali-vapor concentration in combustion gas with special emphasis on pressurized fluidized-bed combustion (PFBC) off-gas. More particularly, the invention relates to the development of a easily regenerable bauxite adsorbent for use in a method to accurately determine the alkali-vapor content of PFBC exhaust gases. 6 figs.

  5. Probing Organic Transistors with Infrared Beams

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Organic Transistors with Infrared Beams Print Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is growing need for the development of electronic devices based on organic polymer materials. Organic field-effect transistors (FETs) are ideal for special applications that require large areas, light weight, and structural flexibility. They also have the advantage of being easy to mass-produce at very low cost. However,

  6. Probing Organic Transistors with Infrared Beams

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Organic Transistors with Infrared Beams Print Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is growing need for the development of electronic devices based on organic polymer materials. Organic field-effect transistors (FETs) are ideal for special applications that require large areas, light weight, and structural flexibility. They also have the advantage of being easy to mass-produce at very low cost. However,

  7. Probing Organic Transistors with Infrared Beams

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Organic Transistors with Infrared Beams Print Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is growing need for the development of electronic devices based on organic polymer materials. Organic field-effect transistors (FETs) are ideal for special applications that require large areas, light weight, and structural flexibility. They also have the advantage of being easy to mass-produce at very low cost. However,

  8. Speckle averaging system for laser raster-scan image projection

    DOE Patents [OSTI]

    Tiszauer, Detlev H. (Tracy, CA); Hackel, Lloyd A. (Livermore, CA)

    1998-03-17

    The viewers' perception of laser speckle in a laser-scanned image projection system is modified or eliminated by the addition of an optical deflection system that effectively presents a new speckle realization at each point on the viewing screen to each viewer for every scan across the field. The speckle averaging is accomplished without introduction of spurious imaging artifacts.

  9. Speckle averaging system for laser raster-scan image projection

    DOE Patents [OSTI]

    Tiszauer, D.H.; Hackel, L.A.

    1998-03-17

    The viewers` perception of laser speckle in a laser-scanned image projection system is modified or eliminated by the addition of an optical deflection system that effectively presents a new speckle realization at each point on the viewing screen to each viewer for every scan across the field. The speckle averaging is accomplished without introduction of spurious imaging artifacts. 5 figs.

  10. ProxiScan?: A Novel Camera for Imaging Prostate Cancer

    ScienceCinema (OSTI)

    Ralph James

    2010-01-08

    ProxiScan is a compact gamma camera suited for high-resolution imaging of prostate cancer. Developed by Brookhaven National Laboratory and Hybridyne Imaging Technologies, Inc., ProxiScan won a 2009 R&D 100 Award, sponsored by R&D Magazine to recognize t

  11. Scanned_Joint_Declaration_(Italian).pdf | Department of Energy

    Energy Savers [EERE]

    Italian).pdf Scanned_Joint_Declaration_(Italian).pdf PDF icon Scanned_Joint_Declaration_(Italian).pdf More Documents & Publications FTCP Face to Face Meeting - March 30, 2010 Introducción al Conocimiento de Energía Energy Education Resources in Spanish Get Current: Switch on Clean Energy Coloring Book

  12. Correlative Electron and Fluorescence Microscopy of Magnetotactic Bacteria in Liquid: Toward In Vivo Imaging

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Woehl, Taylor J.; Kashyap, Sanjay; Firlar, Emre; Perez-Gonzalez, Teresa; Faivre, Damien; Trubitsyn, Denis; Bazylinski, Dennis A.; Prozorov, Tanya

    2014-10-31

    Magnetotactic bacteria biomineralize ordered chains of uniform, membrane-bound magnetite or greigite nanocrystals that exhibit nearly perfect crystal structures and species-specific morphologies. Transmission electron microscopy (TEM) is a critical technique for providing information regarding the organization of cellular and magnetite structures in these microorganisms. However, conventional TEM can only be used to image air-dried or vitrified bacteria removed from their natural environment. Here we present a correlative scanning TEM (STEM) and fluorescence microscopy technique for imaging viable cells of Magnetospirillum magneticum strain AMB-1 in liquid using an in situ fluid cell TEM holder. Fluorescently labeled cells were immobilized on microchip windowmore » surfaces and visualized in a fluid cell with STEM, followed by correlative fluorescence imaging to verify their membrane integrity. Notably, the post-STEM fluorescence imaging indicated that the bacterial cell wall membrane did not sustain radiation damage during STEM imaging at low electron dose conditions. We investigated the effects of radiation damage and sample preparation on the bacteria viability and found that approximately 50% of the bacterial membranes remained intact after an hour in the fluid cell, decreasing to ~30% after two hours. These results represent a first step toward in vivo studies of magnetite biomineralization in magnetotactic bacteria.« less

  13. Correlative Electron and Fluorescence Microscopy of Magnetotactic Bacteria in Liquid: Toward In Vivo Imaging

    SciTech Connect (OSTI)

    Woehl, Taylor J.; Kashyap, Sanjay; Firlar, Emre; Perez-Gonzalez, Teresa; Faivre, Damien; Trubitsyn, Denis; Bazylinski, Dennis A.; Prozorov, Tanya

    2014-10-31

    Magnetotactic bacteria biomineralize ordered chains of uniform, membrane-bound magnetite or greigite nanocrystals that exhibit nearly perfect crystal structures and species-specific morphologies. Transmission electron microscopy (TEM) is a critical technique for providing information regarding the organization of cellular and magnetite structures in these microorganisms. However, conventional TEM can only be used to image air-dried or vitrified bacteria removed from their natural environment. Here we present a correlative scanning TEM (STEM) and fluorescence microscopy technique for imaging viable cells of Magnetospirillum magneticum strain AMB-1 in liquid using an in situ fluid cell TEM holder. Fluorescently labeled cells were immobilized on microchip window surfaces and visualized in a fluid cell with STEM, followed by correlative fluorescence imaging to verify their membrane integrity. Notably, the post-STEM fluorescence imaging indicated that the bacterial cell wall membrane did not sustain radiation damage during STEM imaging at low electron dose conditions. We investigated the effects of radiation damage and sample preparation on the bacteria viability and found that approximately 50% of the bacterial membranes remained intact after an hour in the fluid cell, decreasing to ~30% after two hours. These results represent a first step toward in vivo studies of magnetite biomineralization in magnetotactic bacteria.

  14. Two-photon fluorescence microscopy signal formation in highly scattering media: theoretical and numerical simulation

    SciTech Connect (OSTI)

    Sergeeva, Ekaterina A; Katichev, A R; Kirillin, M Yu

    2011-01-24

    Using the radiative transfer theory and Monte Carlo simulations, we analyse the effect of scattering in a medium and of the size of the detector pinhole on the formation of the fluorescent signal in standard two-photon fluorescence microscopy (TPFM) systems. The theoretical analysis is based on a small-angle diffusion approximation of the radiative transfer equation, adapted to calculate the propagation of focused infrared radiation in media similar to the biological tissues in their optical properties. The accuracy of the model is evaluated by comparing the calculated excitation intensity in a highly scattering medium with the results of Monte Carlo simulations. To simulate a tightly focused Gaussian beam by the Monte Carlo method, the so called 'ray-optics' approach that correctly takes into account the finite size and shape of the beam waist is applied. It is shown that in the combined confocal and two-photon scanning microscopy systems not equipped with an external 'nondescanned' detector, the scattering significantly affects both the nonlinear excitation efficiency in the medium and the fluorescence collection efficiency of the system. In such systems, the rate of the useful TPFM signal in-depth decay is 1.5 - 2 times higher than in systems equipped with a 'nondescanned' detector. (application of lasers and laser-optical methods in life sciences)

  15. Molecular Foundry

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Imaging and Manipulation of Nanostructures This Facility's staff applies and develops techniques to characterize and manipulate a broad variety of nanostructures, from hard to very soft matter, including liquid structures. Imaging methods span electron, optical and scanning probe microscopy, including combined electron-scanning probe and near-field optical-scanning probe instruments. In situ experiments are performed by combining microscopy with manipulation tools and controlled environments.

  16. ALSNews Vol. 344

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    combined synchrotron-based scanning transmission x-ray microscopy with transmission electron microscopy at ALS Beamlines 5.3.2 and 11.0.2 to probe the charging and discharging...

  17. Use of a fiber optic probe for organic species determination

    DOE Patents [OSTI]

    Ekechukwu, Amy A. (Augusta, GA)

    1996-01-01

    A fiber optic probe for remotely detecting the presence and concentration organic species in aqueous solutions. The probe includes a cylindrical housing with an organic species indicator, preferably diaminonaphthyl sulfonic acid adsorbed in a silica gel (DANS-modified gel), contained in the probe's distal end. The probe admits aqueous solutions to the probe interior for mixing within the DANS-modified gel. An optical fiber transmits light through the DANS-modified gel while the indicator reacts with organic species present in the solution, thereby shifting the location of the fluorescent peak. The altered light is reflected to a receiving fiber that carries the light to a spectrophotometer or other analysis device.

  18. Sampling probe for microarray read out using electrospray mass spectrometry

    DOE Patents [OSTI]

    Van Berkel, Gary J.

    2004-10-12

    An automated electrospray based sampling system and method for analysis obtains samples from surface array spots having analytes. The system includes at least one probe, the probe including an inlet for flowing at least one eluting solvent to respective ones of a plurality of spots and an outlet for directing the analyte away from the spots. An automatic positioning system is provided for translating the probe relative to the spots to permit sampling of any spot. An electrospray ion source having an input fluidicly connected to the probe receives the analyte and generates ions from the analyte. The ion source provides the generated ions to a structure for analysis to identify the analyte, preferably being a mass spectrometer. The probe can be a surface contact probe, where the probe forms an enclosing seal along the periphery of the array spot surface.

  19. Cone penetrometer fiber optic raman spectroscopy probe assembly

    DOE Patents [OSTI]

    Kyle, Kevin R. (Brentwood, CA); Brown, Steven B. (Livermore, CA)

    2000-01-01

    A chemically and mechanically robust optical Raman spectroscopy probe assembly that can be incorporated in a cone penetrometer (CPT) for subsurface deployment. This assembly consists of an optical Raman probe and a penetrometer compatible optical probe housing. The probe is intended for in-situ chemical analysis of chemical constituents in the surrounding environment. The probe is optically linked via fiber optics to the light source and the detection system at the surface. A built-in broadband light source provides a strobe method for direct measurement of sample optical density. A mechanically stable sapphire window is sealed directly into the side-wall of the housing using a metallic, chemically resistant, hermetic seal design. This window permits transmission of the interrogation light beam and the resultant signal. The spectroscopy probe assembly is capable of accepting Raman, Laser induced Fluorescence, reflectance, and other optical probes with collimated output for CPT deployment.

  20. Determination of solute site occupancies within γ' precipitates in nickel-base superalloys via orientation-specific atom probe tomography

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Meher, Subhashish; Rojhirunsakool, Tanaporn; Nandwana, Peeyush; Tiley, Jamie; Banerjee, Rajarshi

    2015-04-28

    In this study, the analytical limitations in atom probe tomography such as resolving a desired set of atomic planes, for solving complex materials science problems, have been overcome by employing a well-developed unique and reproducible crystallographic technique, involving synergetic coupling of orientation microscopy with atom probe tomography. The crystallographic information in atom probe reconstructions has been utilized to determine the solute site occupancies in Ni-Al-Cr based superalloys accurately. The structural information in atom probe reveals that both Al and Cr occupy the same sub-lattice within the L12-ordered g precipitates to form Ni3(Al,Cr) precipitates in a Ni-14Al-7Cr(at.%) alloy. Interestingly, the additionmore »of Co, which is a solid solution strengthener, to a Ni-14Al-7Cr alloy results in the partial reversal of Al site occupancy within g precipitates to form (Ni,Al)3(Al,Cr,Co) precipitates. This unique evidence of reversal of Al site occupancy, resulting from the introduction of other solutes within the ordered structures, gives insights into the relative energetics of different sub-lattice sites when occupied by different solutes.« less

  1. Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon (Pinole, CA); Bruchez, Jr., Marcel (Albany, CA); Alivisatos, Paul (Oakland, CA)

    2008-01-01

    A semiconductor nanocrystal compound is described capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source or a particle beam; and (2) an affinity molecule linked to the semiconductor nanocrystal. The semiconductor nanocrystal is linked to an affinity molecule to form a semiconductor nanocrystal probe capable of bonding with a detectable substance. Exposure of the semiconductor nanocrystal to excitation energy will excite the semiconductor nanocrystal causing the emission of electromagnetic radiation. Further described are processes for respectively: making the luminescent semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and using the probe to determine the presence of a detectable substance in a material.

  2. Visual probes and methods for placing visual probes into subsurface areas

    DOE Patents [OSTI]

    Clark, Don T.; Erickson, Eugene E.; Casper, William L.; Everett, David M.

    2004-11-23

    Visual probes and methods for placing visual probes into subsurface areas in either contaminated or non-contaminated sites are described. In one implementation, the method includes driving at least a portion of a visual probe into the ground using direct push, sonic drilling, or a combination of direct push and sonic drilling. Such is accomplished without providing an open pathway for contaminants or fugitive gases to reach the surface. According to one implementation, the invention includes an entry segment configured for insertion into the ground or through difficult materials (e.g., concrete, steel, asphalt, metals, or items associated with waste), at least one extension segment configured to selectively couple with the entry segment, at least one push rod, and a pressure cap. Additional implementations are contemplated.

  3. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with...

  4. In situ Nanotomography and Operando Transmission X-ray Microscopy...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    and Operando Transmission X-ray Microscopy of Micron-sized Ge Particles in Battery Anodes Friday, August 29, 2014 Ge fig1 Figure 1. Schematic of the irreversible...

  5. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in...

  6. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing...

  7. Ultra-high Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Merit Review and Peer Evaluation Meeting, May 18-22, 2009 -- Washington D.C. PDF icon pmp24allard.pdf More Documents & Publications Ultra-High Resolution Electron Microscopy...

  8. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lensless Imaging of Magnetic Nanostructures Work performed on ALS Beamline 12.0.2.2 Citation: J.J. Turner et al., "X-Ray Diffraction Microscopy of Magnetic Structures," Phys....

  9. Eddy current probe with foil sensor mounted on flexible probe tip and method of use

    DOE Patents [OSTI]

    Viertl, John R. M. (Niskayuna, NY); Lee, Martin K. (Niskayuna, NY)

    2001-01-01

    A pair of copper coils are embedded in the foil strip. A first coil of the pair generates an electromagnetic field that induces eddy currents on the surface, and the second coil carries a current influenced by the eddy currents on the surface. The currents in the second coil are analyzed to obtain information on the surface eddy currents. An eddy current probe has a metal housing having a tip that is covered by a flexible conductive foil strip. The foil strip is mounted on a deformable nose at the probe tip so that the strip and coils will conform to the surface to which they are applied.

  10. Reflected beam illumination microscopy using a microfluidics device -

    Office of Scientific and Technical Information (OSTI)

    progress report 6/15/2014. (Technical Report) | SciTech Connect Reflected beam illumination microscopy using a microfluidics device - progress report 6/15/2014. Citation Details In-Document Search Title: Reflected beam illumination microscopy using a microfluidics device - progress report 6/15/2014. Abstract not provided. Authors: James, Conrad D. ; Finnegan, Patrick Sean ; Renzi, Ronald F. Publication Date: 2014-06-01 OSTI Identifier: 1171452 Report Number(s): SAND2014-15063R 534251 DOE

  11. High-Resolution Photocurrent Microscopy Using Near-Field

    Office of Scientific and Technical Information (OSTI)

    Cathodoluminescence of Quantum Dots. (Journal Article) | SciTech Connect High-Resolution Photocurrent Microscopy Using Near-Field Cathodoluminescence of Quantum Dots. Citation Details In-Document Search Title: High-Resolution Photocurrent Microscopy Using Near-Field Cathodoluminescence of Quantum Dots. Abstract not provided. Authors: Talin, Albert Alec Publication Date: 2013-05-01 OSTI Identifier: 1145404 Report Number(s): SAND2013-4169J 453180 DOE Contract Number: DE-AC04-94AL85000 Resource

  12. In-Situ Electron Microscopy of Electrical Energy Storage Materials |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy 1 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies Program Annual Merit Review and Peer Evaluation PDF icon es095_unocic_2011_o.pdf More Documents & Publications In-Situ Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials In-situ characterization and diagnostics of mechanical degradation in electrodes

  13. Iran Thomas Auditorium, 8600 Environmental Transmission Electron Microscopy for Catalysis

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    April 26, 2012 11:00 am Iran Thomas Auditorium, 8600 Environmental Transmission Electron Microscopy for Catalysis Research: The Example of Carbon Nanotubes Eric A. Stach Center for Functional Nanomaterials Brookhaven National Laboratory CNMS D D I I S S C C O O V V E E R R Y Y SEMINAR SERIES Abstract: Environmental transmission electron microscopy allows the imaging of materials in the presence of relatively high pressures of gas (several Torr) without loss of either spatial or temporal

  14. Ultra-High Resolution Electron Microscopy for Catalyst Characterization |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy 0 DOE Vehicle Technologies and Hydrogen Programs Annual Merit Review and Peer Evaluation Meeting, June 7-11, 2010 -- Washington D.C. PDF icon pm029_allard_2010_p.pdf More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization Characterization of Catalysts for Aftertreatment and Biomass-derived Fuels: Success Stories from the High Temperature Materials

  15. Electron Microscopy Catalysis Projects: Success Stories from the High

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Temperature Materials Laboratory (HTML) User Program | Department of Energy Electron Microscopy Catalysis Projects: Success Stories from the High Temperature Materials Laboratory (HTML) User Program Electron Microscopy Catalysis Projects: Success Stories from the High Temperature Materials Laboratory (HTML) User Program 2009 DOE Hydrogen Program and Vehicle Technologies Program Annual Merit Review and Peer Evaluation Meeting, May 18-22, 2009 -- Washington D.C. PDF icon lmp_01_allard.pdf More

  16. Ultra-sensitive Magnetic Microscopy with an Atomic Magnetometer (Technical

    Office of Scientific and Technical Information (OSTI)

    Report) | SciTech Connect Technical Report: Ultra-sensitive Magnetic Microscopy with an Atomic Magnetometer Citation Details In-Document Search Title: Ultra-sensitive Magnetic Microscopy with an Atomic Magnetometer The PowerPoint presentation focused on research goals, specific information about the atomic magnetometer, response and resolution factors of the SERF magnetometer, FC+AM systems, tests of field transfer and resolution on FC, gradient cancellation, testing of AM performance, ideas

  17. Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide

    Office of Scientific and Technical Information (OSTI)

    Flakes (Journal Article) | SciTech Connect Journal Article: Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes Citation Details In-Document Search Title: Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes × You are accessing a document from the Department of Energy's (DOE) SciTech Connect. This site is a product of DOE's Office of Scientific and Technical Information (OSTI) and is provided as a public service. Visit OSTI to utilize

  18. Localized surface plasmon assisted contrast microscopy for ultrathin transparent specimens

    SciTech Connect (OSTI)

    Wei, Feifei; Lu, Dylan; Aguinaldo, Ryan; Ma, Yicong; Sinha, Sunil K.; Liu, Zhaowei

    2014-10-20

    We demonstrate a high contrast imaging technique, termed localized surface plasmon assisted contrast microscopy, by combining localized surface plasmon resonances (LSPR) and dark-field microscopy technique. Due to the sensitive response of LSPR to the refractive index of the surrounding media, this technique is capable of converting a small refractive index difference to a change in scattering intensity, resulting in a high-contrast, diffraction limited image of a thin unstained specimen with small, gradual refractive-index variation.

  19. Heuristic optimization of the scanning path of particle therapy beams

    SciTech Connect (OSTI)

    Pardo, J.; Donetti, M.; Bourhaleb, F.; Ansarinejad, A.; Attili, A.; Cirio, R.; Garella, M. A.; Giordanengo, S.; Givehchi, N.; La Rosa, A.; Marchetto, F.; Monaco, V.; Pecka, A.; Peroni, C.; Russo, G.; Sacchi, R.

    2009-06-15

    Quasidiscrete scanning is a delivery strategy for proton and ion beam therapy in which the beam is turned off when a slice is finished and a new energy must be set but not during the scanning between consecutive spots. Different scanning paths lead to different dose distributions due to the contribution of the unintended transit dose between spots. In this work an algorithm to optimize the scanning path for quasidiscrete scanned beams is presented. The classical simulated annealing algorithm is used. It is a heuristic algorithm frequently used in combinatorial optimization problems, which allows us to obtain nearly optimal solutions in acceptable running times. A study focused on the best choice of operational parameters on which the algorithm performance depends is presented. The convergence properties of the algorithm have been further improved by using the next-neighbor algorithm to generate the starting paths. Scanning paths for two clinical treatments have been optimized. The optimized paths are found to be shorter than the back-and-forth, top-to-bottom (zigzag) paths generally provided by the treatment planning systems. The gamma method has been applied to quantify the improvement achieved on the dose distribution. Results show a reduction of the transit dose when the optimized paths are used. The benefit is clear especially when the fluence per spot is low, as in the case of repainting. The minimization of the transit dose can potentially allow the use of higher beam intensities, thus decreasing the treatment time. The algorithm implemented for this work can optimize efficiently the scanning path of quasidiscrete scanned particle beams. Optimized scanning paths decrease the transit dose and lead to better dose distributions.

  20. Quantum metrology to probe atomic parity nonconservation

    SciTech Connect (OSTI)

    Mandal, P.; Mukherjee, M. [Raman Center for Atomic, Molecular, and Optical Sciences, Indian Association for the Cultivation of Science, Kolkata 700 032 (India)

    2010-11-15

    An entangled state prepared in a decoherence-free subspace, together with a Ramsey-type measurement, can probe parity violation in heavy alkali-metal ions such as Ba{sup +} or Ra{sup +}. Here we propose an experiment with Ba{sup +} as an example to measure the small parity-violating effect in this system. It has been shown that a measurement on a maximally correlated system will reduce the uncertainty as compared to that on a single ion measurement, and also provides a feasible solution to measure the nuclear-spin-dependent part of the total parity-violating light shift in an ionic system.

  1. Langmuir Probe Measurements in Plasma Shadows

    SciTech Connect (OSTI)

    Waldmann, O.; Koch, B.; Fussmann, G.

    2006-01-15

    When immersing a target into a plasma streaming along magnetic field lines, a distinct shadow region extending over large distances is observed by the naked eye downstream of the target.In this work we present an experimental study of the effect applying Langmuir probes. In contrast to expectations, there are only marginal changes in the profiles of temperature and density behind masks that cut away about 50% of the plasma cross-section. On the other hand, the mean density is drastically reduced by an order of magnitude. First attempts to simulate the observations by solving the classical 2D diffusion equation were not successful.

  2. Probes for anionic cell surface detection

    DOE Patents [OSTI]

    Smith, Bradley D.

    2013-03-05

    Embodiments of the present invention are generally directed to compositions comprising a class of molecular probes for detecting the presence of anionic cell surfaces. Embodiments include compositions that are enriched for these compositions and preparations, particularly preparations suitable for use as laboratory/clinical reagents and diagnostic indicators, either alone or as part of a kit. An embodiment of the invention provides for a highly selective agent useful in the discernment and identification of dead or dying cells, such as apoptotic cells, in a relatively calcium-free environment. An embodiment of the invention provides a selective agent for the identification of bacteria in a mixed population of bacterial cells and nonbacterial cells.

  3. Probing lepton number violation on three frontiers

    SciTech Connect (OSTI)

    Deppisch, Frank F. [Department of Physics and Astronomy, University College London (United Kingdom)

    2013-12-30

    Neutrinoless double beta decay constitutes the main probe for lepton number violation at low energies, motivated by the expected Majorana nature of the light but massive neutrinos. On the other hand, the theoretical interpretation of the (non-)observation of this process is not straightforward as the Majorana neutrinos can destructively interfere in their contribution and many other New Physics mechanisms can additionally mediate the process. We here highlight the potential of combining neutrinoless double beta decay with searches for Tritium decay, cosmological observations and LHC physics to improve the quantitative insight into the neutrino properties and to unravel potential sources of lepton number violation.

  4. Ionization probes of molecular structure and chemistry

    SciTech Connect (OSTI)

    Johnson, P.M.

    1993-12-01

    Various photoionization processes provide very sensitive probes for the detection and understanding of the spectra of molecules relevant to combustion processes. The detection of ionization can be selective by using resonant multiphoton ionization or by exploiting the fact that different molecules have different sets of ionization potentials. Therefore, the structure and dynamics of individual molecules can be studied even in a mixed sample. The authors are continuing to develop methods for the selective spectroscopic detection of molecules by ionization, and to use these methods for the study of some molecules of combustion interest.

  5. Probing the Surprising Secrets of Carbonic Acid

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The Surprising Secrets of Carbonic Acid Probing the Surprising Secrets of Carbonic Acid Berkeley Lab Study Holds Implications for Geological and Biological Processes October 23, 2014 Contact: Lynn Yarris, lcyarris@lbl.gov, 510.486.5375 CarbonicAcid Though carbonic acid exists for only a fraction of a second before changing into a mix of hydrogen and bicarbonate ions, it is critical to both the health of the atmosphere and the human body. Though it garners few public headlines, carbonic acid, the

  6. Organo Luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes

    DOE Patents [OSTI]

    Weiss, Shimon (Pinole, CA); Bruchez, Jr., Marcel (Albany, CA); Alivisatos, Paul (Oakland, CA)

    1999-01-01

    A luminescent semiconductor nanocrystal compound is described which is capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation (luminescing) in a narrow wavelength band and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source (of narrow or broad bandwidth) or a particle beam; and (2) at least one linking agent, having a first portion linked to the semiconductor nanocrystal and a second portion capable of linking to an affinity molecule. The luminescent semiconductor nanocrystal compound is linked to an affinity molecule to form an organo luminescent semiconductor nanocrystal probe capable of bonding with a detectable substance in a material being analyzed, and capable of emitting electromagnetic radiation in a narrow wavelength band and/or absorbing, scattering, or diffracting energy when excited by an electromagnetic radiation source (of narrow or broad bandwidth) or a particle beam. The probe is stable to repeated exposure to light in the presence of oxygen and/or other radicals. Further described is a process for making the luminescent semiconductor nanocrystal compound and for making the organo luminescent semiconductor nanocrystal probe comprising the luminescent semiconductor nanocrystal compound linked to an affinity molecule capable of bonding to a detectable substance. A process is also described for using the probe to determine the presence of a detectable substance in a material.

  7. Three-axis particle impact probe

    DOE Patents [OSTI]

    Fasching, George E. (Morgantown, WV); Smith, Jr., Nelson S. (Morgantown, WV); Utt, Carroll E. (Morgantown, WV)

    1992-01-01

    Three-axis particle impact probes detect particle impact vectors along x-, y-, and z-axes by spherical probe head mounted on the outer end of a shaft that is flexibly mounted in silicone rubber at the top of a housing so as to enable motion imparted to the head upon impact to be transmitted to a grounded electrode secured to the shaft within the housing. Excitable electrodes are mounted in the housing in a fixed position, spaced apart from the ground electrode and forming, with the ground electrode, capacitor pairs. Movement of the ground electrode results in changes in capacitance, and these difference in capacitance are used for measurement or derivation of momentum vectors along each of the three axes. In one embodiment, the ground electrode is mounted at the base of the shaft and is secured to a silicone rubber layer at the top of the housing, providing for cantilevered movement. In another embodiment, the shaft is mounted at its mid point in a flexible bushing so that it undergoes pivotal movement around that point.

  8. Probe with integrated heater and thermocouple pack

    DOE Patents [OSTI]

    McCulloch, Reg W. (Oak Ridge, TN); Dial, Ralph E. (Concord, TN); Finnell, Wilber K. R. (Kingston, TN)

    1990-01-01

    A probe for measuring heat includes an elongate rod fitted within a sheath, and a plurality of annular recesses are formed on the surface of the rod in a spaced-apart relationship to form annular chambers that are resistant to heat flow. A longitudinal bore extends axially into the rod and within the cylinders defined by the annular chambers, and an integrated heater and thermocouple pack is dimensioned to fit within the bore. In construction, the integrated pack includes a plurality of wires disposed in electrical insulation within a sheath and a heater cable. These wires include one common wire and a plurality of thermocuple wires. The common wire is constructed of one type of conductive material while the thermocouple wires are each constructed of two types of materials so that at least one thermocouple junction is formed therein. All of the wires extend the length of the integrated pack and are connected together at their ends. The thermocouple wires are constructed to form thermocouple junctions proximate to each annular chamber for producing electromotive forces corresponding to the temperature of the rod within the annular chambers relative to outside the chambers. In the preferred embodiment, each thermocouple wire forms two thermocouple junctions, one junction being disposed within an annular chamber and the second junction being disposed outside of, but proximate to, the same annular chamber. In one embodiment two thermocouple wires are configured to double the sensitivity of the probe in one region.

  9. Probe with integrated heater and thermocouple pack

    DOE Patents [OSTI]

    McCulloch, Reginald W. (Oak Ridge, TN); Dial, Ralph E. (Concord, TN); Finnell, Wilber K. R. (Kingston, TN)

    1988-01-01

    A probe for measuring heat includes an elongate rod fitted within a sheath, and a plurality of annular recesses are formed on the surface of the rod in a spaced-apart relationship to form annular chambers that are resistant to heat flow. A longitudinal bore extends axially into the rod and within the cylinders defined by the annular chambers, and an integrated heater and thermocouple pack is dimensioned to fit within the bore. In construction, the integrated pack includes a plurality of wires disposed in electrical insulation within a sheath and a heater cable. These wires include one common wire and a plurality of thermocouple wires. The common wire is constructed of one type of conductive material while the thermocouple wires are each constructed of two types of materials so that at least one thermocouple junction is formed therein. All of the wires extend the length of the integrated pack and are connected together at their ends. The thermocouple wires are constructed to form thermocouple junctions proximate to each annular chamber for producing electromotive forces corresponding to the temperature of the rod within the annular chambers relative to outside the chambers. In the preferred embodiment, each thermocouple wire forms two thermocouple junctions, one junction being disposed within an annular chamber and the second junction being disposed outside of, but proximate to, the same annular chamber. In one embodiment two thermocouple wires are configured to double the sensitivity of the probe in one region.

  10. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    objects opaque to visible light, and tomographic techniques related to those used in CAT scans give access to three-dimensional images. The rub is that lenses that can focus x...

  11. Inspired Designs Help Kids Get Through Medical Scans | GE Global...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Kids Get Through Medical Scans Global Design Team 2015.09.23 September is Childhood Cancer Awareness Month and we are publishing a series of blog posts to share stories about...

  12. LandScan 2003 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2004-01-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  13. LandScan 2007 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2008-01-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  14. LandScan 2010 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2010-07-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  15. LandScan 2002 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2003-01-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  16. LandScan 2008 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2009-01-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  17. LandScan 2005 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2006-01-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  18. LandScan 2009 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2009-07-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  19. LandScan 2004 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2005-01-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  20. LINEAR SCANNING METHOD BASED ON THE SAFT COARRAY

    SciTech Connect (OSTI)

    Martin, C. J.; Martinez-Graullera, O.; Romero, D.; Ullate, L. G.; Higuti, R. T.

    2010-02-22

    This work presents a method to obtain B-scan images based on linear array scanning and 2R-SAFT. Using this technique some advantages are obtained: the ultrasonic system is very simple; it avoids the grating lobes formation, characteristic in conventional SAFT; and subaperture size and focussing lens (to compensate emission-reception) can be adapted dynamically to every image point. The proposed method has been experimentally tested in the inspection of CFRP samples.

  1. LandScan 2006 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2006-01-01

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  2. LandScan 2013 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2014-07-01

    The LandScan data set is a worldwide population database compiled on a 30"x30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on land cover, slope, road proximity, high-resolution imagery, and other data sets. The LandScan data set was developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient populations at risk.

  3. Continuous motion scan ptychography: characterization for increased speed

    Office of Scientific and Technical Information (OSTI)

    in coherent x-ray imaging (Journal Article) | DOE PAGES Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging « Prev Next » Title: Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging Authors: Deng, Junjing ; Nashed, Youssef S. G. ; Chen, Si ; Phillips, Nicholas W. ; Peterka, Tom ; Ross, Rob ; Vogt, Stefan ; Jacobsen, Chris ; Vine, David J. Publication Date: 2015-02-23 OSTI Identifier: 1222333

  4. Continuous motion scan ptychography: characterization for increased speed

    Office of Scientific and Technical Information (OSTI)

    in coherent x-ray imaging (Journal Article) | SciTech Connect SciTech Connect Search Results Journal Article: Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging Citation Details In-Document Search Title: Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging Authors: Deng, Junjing ; Nashed, Youssef S. G. ; Chen, Si ; Phillips, Nicholas W. ; Peterka, Tom ; Ross, Rob ; Vogt, Stefan ; Jacobsen, Chris ;

  5. CT Scan of Earth Links Mantle Plumes with Volcanic Hotspots

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    CT Scan of Earth Links Mantle Plumes with Volcanic Hotspots CT Scan of Earth Links Mantle Plumes with Volcanic Hotspots Simulations Run at NERSC Show How Seismic Waves Travel Through Mantle September 2, 2015 Robert Sanders, rlsanders@berkeley.edu, (510) 643-6998 NERSC PI: Barbara Romanowicz Lead Institution: University of California, Berkeley Project Title: Imaging and Calibration of Mantle Structure at Global and Regional Scales Using Full-Waveform Seismic Tomography NERSC Resources Used:

  6. LandScan 2011 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2012-11-19

    The LandScan data set is a worldwide population database compiled on a 30" x 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. LandScan 2001 has been developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient population risk.

  7. LandScan 2000 High Resolution Global Population Data Set

    Energy Science and Technology Software Center (OSTI)

    2001-12-31

    The LandScan data set is a worldwide population database compiled on a 30" X 30" latitude/longitude grid. Census counts (at sub-national level) were apportioned to each grid cell based on likelihood coefficients, which are based on proximity to roads, slope, land cover, nighttime lights, and other data sets. The LandScan data set was developed as part of Oak Ridge National Laboratory (ORNL) Global Population Project for estimating ambient populations at risk.

  8. Use of a fiber optic probe for organic species determination

    DOE Patents [OSTI]

    Ekechukwu, A.A.

    1996-12-10

    A fiber optic probe is described for remotely detecting the presence and concentration organic species in aqueous solutions. The probe includes a cylindrical housing with an organic species indicator, preferably diaminonaphthyl sulfonic acid adsorbed in a silica gel (DANS-modified gel), contained in the probe`s distal end. The probe admits aqueous solutions to the probe interior for mixing within the DANS-modified gel. An optical fiber transmits light through the DANS-modified gel while the indicator reacts with organic species present in the solution, thereby shifting the location of the fluorescent peak. The altered light is reflected to a receiving fiber that carries the light to a spectrophotometer or other analysis device. 5 figs.

  9. Electrical probe diagnostics for the laminar flame quenching distance

    SciTech Connect (OSTI)

    Karrer, Maxime; Makarov, Maxime; Bellenoue, Marc; Labuda, Sergei; Sotton, Julien

    2010-02-15

    A simplified theory, previously developed for the general case of weakly ionized gas flow, is used to predict electrical probe response when the flame is quenched on the probe surface. This theory is based on the planar model of space charge sheaths around the measuring electrode. For the flame quenching case, by assuming that the sheath thickness is comparable with the thermal boundary layer thickness, probe current can be related to flame quenching distance. The theoretical assumptions made to obtain the analytical formulation of probe current were experimentally proved by using direct visualization and high-frequency PIV. The direct visualization method was also used to validate the results of flame quenching distance values obtained with electrical probe. The electrical probe diagnostics have been verified for both head-on and sidewall flame quenching regimes and for stoichiometric methane/air and propane/air mixtures in a pressure range of 0.05-0.6 MPa. (author)

  10. Linearization of scan velocity of resonant vibrating-mirror beam deflectors

    DOE Patents [OSTI]

    Yeung, E.S.; Chen, S.L.

    1991-01-15

    A means and method for producing linearization of scan velocity of resonant vibrating-mirror beam deflectors in laser scanning system including presenting an elliptical convex surface to the scanning beam to reflect the scanning beam to the focal plane of the scanning line. The elliptical surface is shaped to produce linear velocity of the reflective scanning beam at the focal plane. Maximization of linearization is accomplished by considering sets of criteria for different scanning applications. 6 figures.

  11. Probing Core-Hole Localization in Molecular Nitrogen

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing Core-Hole Localization in Molecular Nitrogen Probing Core-Hole Localization in Molecular Nitrogen Print Wednesday, 25 February 2009 00:00 The behavior of the core hole created in molecular x-ray photoemission experiments has provided molecular scientists with a valuable window through which to probe the electronic structure and dynamics of molecules. But the answer to one fundamental quantum question-whether the core hole is localized or delocalized-has remained elusive for diatomic

  12. Geologic and Environmental Probe System - Energy Innovation Portal

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Industrial Technologies Industrial Technologies Energy Analysis Energy Analysis Find More Like This Return to Search Geologic and Environmental Probe System (GEOPS) Idaho National Laboratory Contact INL About This Technology Publications: PDF Document Publication Technology Fact Sheet (144 KB) Installing an instrument in the probe casing is safe and easy. Installing an instrument in the probe casing is safe and easy. Technology Marketing Summary Migration of contaminants from buried waste sites

  13. Surface-enhanced Raman scattering (SERS) dosimeter and probe

    DOE Patents [OSTI]

    Vo-Dinh, T.

    1995-03-21

    A dosimeter and probe for measuring exposure to chemical and biological compounds is disclosed. The dosimeter or probe includes a collector which may be analyzed by surface-enhanced Raman spectroscopy. The collector comprises a surface-enhanced Raman scattering-active material having a coating applied thereto to improve the adsorption properties of the collector. The collector may also be used in automated sequential devices, in probe array devices. 10 figures.

  14. Surface-enhanced Raman scattering (SERS) dosimeter and probe

    DOE Patents [OSTI]

    Vo-Dinh, Tuan (Knoxville, TN)

    1995-01-01

    A dosimeter and probe for measuring exposure to chemical and biological compounds is disclosed. The dosimeter or probe includes a collector which may be analyzed by surface-enhanced Raman spectroscopy. The collector comprises a surface-enhanced Raman scattering-active material having a coating applied thereto to improve the adsorption properties of the collector. The collector may also be used in automated sequential devises, in probe array devices.

  15. Design and analysis of mismatch probes for long oligonucleotide...

    Office of Scientific and Technical Information (OSTI)

    (MM) probes were designed for each of ten target genes selected from three microorganisms. The microarrays were hybridized with synthesized complementary oligonucleotide...

  16. Test probe for surface mounted leadless chip carrier

    DOE Patents [OSTI]

    Meyer, K.L.; Topolewski, J.

    1987-10-02

    A test probe for a surface mounted leadless chip carrier is disclosed. The probe includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe. 1 fig.

  17. Contamination effects on fixed-bias Langmuir probes

    SciTech Connect (OSTI)

    Steigies, C. T.; Barjatya, A.

    2012-11-15

    Langmuir probes are standard instruments for plasma density measurements on many sounding rockets. These probes can be operated in swept-bias as well as in fixed-bias modes. In swept-bias Langmuir probes, contamination effects are frequently visible as a hysteresis between consecutive up and down voltage ramps. This hysteresis, if not corrected, leads to poorly determined plasma densities and temperatures. With a properly chosen sweep function, the contamination parameters can be determined from the measurements and correct plasma parameters can then be determined. In this paper, we study the contamination effects on fixed-bias Langmuir probes, where no hysteresis type effect is seen in the data. Even though the contamination is not evident from the measurements, it does affect the plasma density fluctuation spectrum as measured by the fixed-bias Langmuir probe. We model the contamination as a simple resistor-capacitor circuit between the probe surface and the plasma. We find that measurements of small scale plasma fluctuations (meter to sub-meter scale) along a rocket trajectory are not affected, but the measured amplitude of large scale plasma density variation (tens of meters or larger) is attenuated. From the model calculations, we determine amplitude and cross-over frequency of the contamination effect on fixed-bias probes for different contamination parameters. The model results also show that a fixed bias probe operating in the ion-saturation region is affected less by contamination as compared to a fixed bias probe operating in the electron saturation region.

  18. Probing Radiation Damage in Plutonium Alloys with Multiple Measurement...

    Office of Scientific and Technical Information (OSTI)

    Conference: Probing Radiation Damage in Plutonium Alloys with Multiple Measurement ... as well as external parameters such as the temperature and starting material composition. ...

  19. Probing Uranium's Mysteries | Y-12 National Security Complex

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    resonance probe, chemist Ashley Stowe explores previously unseen properties of uranium. He also aims to prevent illegal trafficking of that commodity through his...

  20. Probing the surface structure of divalent transition metals using...

    Office of Scientific and Technical Information (OSTI)

    structure of divalent transition metals using surface specific solid-state NMR spectroscopy Citation Details In-Document Search Title: Probing the surface structure of...

  1. Selection of optimal oligonucleotide probes for microarrays usingmulti...

    Office of Scientific and Technical Information (OSTI)

    other filters. Final probes are pickedusing a combination of user-configurable piece-wise linear functions andan iterative process. The thresholds for identity, stretch and...

  2. Picture of the Week: Laser probe for critical subcriticals

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    03 Laser probe for critical subcriticals This specialized laser instrument allows Los Alamos scientists to perform sophisticated nuclear experiments and gather significant amounts...

  3. Direct Probe Mounted High-Performance Amplifiers for Pulsed Measuremen...

    Office of Scientific and Technical Information (OSTI)

    Direct Probe Mounted High-Performance Amplifiers for Pulsed Measurement Citation Details ... Visit OSTI to utilize additional information resources in energy science and technology. A ...

  4. Direct Probe Mounted High-Performance Amplifiers for Pulsed Measuremen...

    Office of Scientific and Technical Information (OSTI)

    Direct Probe Mounted High-Performance Amplifiers for Pulsed Measurement Citation Details ... Country of Publication: United States Language: English Subject: Materials Science(36) ...

  5. Probing the surface structure of divalent transition metals using...

    Office of Scientific and Technical Information (OSTI)

    the surface structure of divalent transition metals using surface specific solid-state NMR spectroscopy Citation Details In-Document Search Title: Probing the surface...

  6. Probing Core-Hole Localization in Molecular Nitrogen

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    molecular scientists with a valuable window through which to probe the electronic structure and dynamics of molecules. But the answer to one fundamental quantum...

  7. Optimization of a low noise detection circuit for probing the structure of damage cascades with IBIC

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Auden, Elizabeth C.; Doyle, Barney L.; Bielejec, Edward; Vizkelethy, Gyorgy; Wampler, William R.

    2015-06-18

    Optimal detector / pre-amplifier combinations have been identified for the use of light ion IBIC (ion beam induced charge) to probe the physical structure of electrically active defects in damage cascades caused by heavy ion implantation. The ideal detector must have a sufficiently thin dead layer that incident ions will produce the majority of damage cascades in the depletion region of the detector rather than the dead layer. Detector and circuit noise must be low enough to detect the implantation of a single heavy ion as well as the decrease in the light ion IBIC signal caused by Shockley-Read-Hall recombinationmore » when the beam scans regions of the detector damaged by the heavy ion. The IBIC signals from three detectors irradiated with 750 keV He⁺ ions are measured with commercial and bespoke charge sensitive pre-amplifiers to identify the combination with the lowest noise.« less

  8. Chemical sensor with oscillating cantilevered probe

    DOE Patents [OSTI]

    Adams, Jesse D

    2013-02-05

    The invention provides a method of detecting a chemical species with an oscillating cantilevered probe. A cantilevered beam is driven into oscillation with a drive mechanism coupled to the cantilevered beam. A free end of the oscillating cantilevered beam is tapped against a mechanical stop coupled to a base end of the cantilevered beam. An amplitude of the oscillating cantilevered beam is measured with a sense mechanism coupled to the cantilevered beam. A treated portion of the cantilevered beam is exposed to the chemical species, wherein the cantilevered beam bends when exposed to the chemical species. A second amplitude of the oscillating cantilevered beam is measured, and the chemical species is determined based on the measured amplitudes.

  9. Imaging hydrated microbial extracellular polymers: Comparative analysis by electron microscopy

    SciTech Connect (OSTI)

    Dohnalkova, A.C.; Marshall, M. J.; Arey, B. W.; Williams, K. H.; Buck, E. C.; Fredrickson, J. K.

    2011-01-01

    Microbe-mineral and -metal interactions represent a major intersection between the biosphere and geosphere but require high-resolution imaging and analytical tools for investigating microscale associations. Electron microscopy has been used extensively for geomicrobial investigations and although used bona fide, the traditional methods of sample preparation do not preserve the native morphology of microbiological components, especially extracellular polymers. Herein, we present a direct comparative analysis of microbial interactions using conventional electron microscopy approaches of imaging at room temperature and a suite of cryogenic electron microscopy methods providing imaging in the close-to-natural hydrated state. In situ, we observed an irreversible transformation of the hydrated bacterial extracellular polymers during the traditional dehydration-based sample preparation that resulted in their collapse into filamentous structures. Dehydration-induced polymer collapse can lead to inaccurate spatial relationships and hence could subsequently affect conclusions regarding nature of interactions between microbial extracellular polymers and their environment.

  10. Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

    SciTech Connect (OSTI)

    Miccio, Luis A. Colmenero, Juan; Kummali, Mohammed M.; Alegra, ngel; Schwartz, Gustavo A.

    2014-05-14

    The use of an atomic force microscope for studying molecular dynamics through dielectric spectroscopy with spatial resolution in the nanometer scale is a recently developed approach. However, difficulties in the quantitative connection of the obtained data and the material dielectric properties, namely, frequency dependent dielectric permittivity, have limited its application. In this work, we develop a simple electrical model based on physically meaningful parameters to connect the atomic force microscopy (AFM) based dielectric spectroscopy experimental results with the material dielectric properties. We have tested the accuracy of the model and analyzed the relevance of the forces arising from the electrical interaction with the AFM probe cantilever. In this way, by using this model, it is now possible to obtain quantitative information of the local dielectric material properties in a broad frequency range. Furthermore, it is also possible to determine the experimental setup providing the best sensitivity in the detected signal.

  11. Phase contrast and operation regimes in multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Santos, Sergio

    2014-04-07

    In amplitude modulation atomic force microscopy the attractive and the repulsive force regimes induce phase shifts above and below 90°, respectively. In the more recent multifrequency approach, however, multiple operation regimes have been reported and the theory should be revisited. Here, a theory of phase contrast in multifrequency atomic force microscopy is developed and discussed in terms of energy transfer between modes, energy dissipation and the kinetic energy and energy transfer associated with externally driven harmonics. The single frequency virial that controls the phase shift might undergo transitions in sign while the average force (modal virial) remains positive (negative)

  12. Variable temperature electrochemical strain microscopy of Sm-doped ceria

    SciTech Connect (OSTI)

    Jesse, Stephen; Morozovska, A. N.; Kalinin, Sergei V; Eliseev, E. A.; Yang, Nan; Doria, Sandra; Tebano, Antonello

    2013-01-01

    Variable temperature electrochemical strain microscopy has been used to study the electrochemical activity of Sm-doped ceria as a function of temperature and bias. The electrochemical strain microscopy hysteresis loops have been collected across the surface at different temperatures and the relative activity at different temperatures has been compared. The relaxation behavior of the signal at different temperatures has been also evaluated to relate kinetic process during bias induced electrochemical reactions with temperature and two different kinetic regimes have been identified. The strongly non-monotonic dependence of relaxation behavior on temperature is interpreted as evidence for water-mediated mechanisms.

  13. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes

  14. Advantages of Microscopy Method for Imaging Nanocatalysts | Argonne

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    National Laboratory Advantages of Microscopy Method for Imaging Nanocatalysts February 11, 2016 Tweet EmailPrint Aberration-corrected (AC) STEM, AC-TEM and in situ X-ray absorption fine structure spectroscopy (XAFS) were used by users from UOP-Honeywell, working with researchers in the CNM Electron Microscopy Center and APS, to characterize Pt clusters on a 0.35 wt % Pt on g-alumina support after reduction in hydrogen at 700oC. STEM high-angle annular dark field imaging shows that cluster

  15. Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae

    SciTech Connect (OSTI)

    Deng, Junjing; Vine, David J.; Chen, Si; Nashed, Youssef S. G.; Jin, Qiaoling; Phillips, Nicholas W.; Peterka, Tom; Ross, Rob; Vogt, Stefan; Jacobsen, Chris J.

    2015-02-24

    Trace metals play important roles in normal and in disease-causing biological functions. X-ray fluorescence microscopy reveals trace elements with no dependence on binding affinities (unlike with visible light fluorophores) and with improved sensitivity relative to electron probes. However, X-ray fluorescence is not very sensitive for showing the light elements that comprise the majority of cellular material. Here we show that X-ray ptychography can be combined with fluorescence to image both cellular structure and trace element distribution in frozen-hydrated cells at cryogenic temperatures, with high structural and chemical fidelity. Ptychographic reconstruction algorithms deliver phase and absorption contrast images at a resolution beyond that of the illuminating lens or beam size. Using 5.2-keV X-rays, we have obtained sub–30-nm resolution structural images and ~90-nm–resolution fluorescence images of several elements in frozen-hydrated green algae. This combined approach offers a way to study the role of trace elements in their structural context.

  16. Elucidation of Perovskite Film Micro-Orientations Using Two-Photon Total Internal Reflectance Fluorescence Microscopy

    SciTech Connect (OSTI)

    Watson, Brianna R; Yang, Bin; Xiao, Kai; Ma, Yingzhong; Doughty, Benjamin L; Calhoun, Tessa R

    2015-01-01

    The emergence of efficient hybrid organic-inorganic perovskite photovoltaic materials has caused the rapid development of a variety of preparation and processing techniques designed to maximize their performance. As processing methods continue to emerge, it is important to understand how the optical properties of these materials are affected on a microscopic scale. Here polarization resolved two-photon total internal reflectance microscopy (TIRFM) was used to probe changes in transition dipole moment orientation as a function of thermal annealing time in hybrid organic-inorganic lead iodide based perovskite (CH3NH3PbI3) thin films on glass. These results show that as thermal annealing time is increased the distribution of transition moments pointing out-of-plane decreases in favor of forming areas with increased in-plane orientations. It was also shown through the axial sensitivity of TIRFM that the surface topography is manifested in the signal intensity and can be used to survey aspects of morphology in coincidence with the optical properties of these films.

  17. Lessons learned on the presentation of scan data

    SciTech Connect (OSTI)

    King, David A.; Vitkus, Tim

    2015-11-01

    Technicians performed a radiological survey of a surplus metal tank to support disposition planning at an Oak Ridge, Tennessee site. The survey included radiation scans to identify contamination and, if identified, define the boundary and magnitude of contamination. Fixed-point 1-minute measurements were also collected at randomly selected locations for comparison against the site's free release limit of 5,000 disintegrations per minute per 100 cm (dpm/100 cm) (0.83 Bq/cm). Scan data were recorded using a data logger as a means to document surveyor observation - logged data captured at 1-second intervals and converted to counts per minute (cpm) by the data logger software were presented in the project report. Both the qualitative scan data (in cpm) and the quantitative direct measurement (in dpm/100 cm) were reported for completeness, so stakeholders had all available information to support disposition decisions. However, a new stakeholder - introduced to the project at the reporting phase of work - used the instrument efficiency and background data to convert the scan data from cpm to dpm/100 cm, then compared the converted results to the site limit. Many of the converted values exceeded 5,000 dpm/100 cm. This resulted in delays in tank disposition and additional project costs which could have been avoided if the proper use and interpretation of scan data, and implications of radon progeny buildup on oxidized metal surfaces, had been better communicated.

  18. Electrostatically focused addressable field emission array chips (AFEA's) for high-speed massively parallel maskless digital E-beam direct write lithography and scanning electron microscopy

    DOE Patents [OSTI]

    Thomas, Clarence E.; Baylor, Larry R.; Voelkl, Edgar; Simpson, Michael L.; Paulus, Michael J.; Lowndes, Douglas H.; Whealton, John H.; Whitson, John C.; Wilgen, John B.

    2002-12-24

    Systems and methods are described for addressable field emission array (AFEA) chips. A method of operating an addressable field-emission array, includes: generating a plurality of electron beams from a pluralitly of emitters that compose the addressable field-emission array; and focusing at least one of the plurality of electron beams with an on-chip electrostatic focusing stack. The systems and methods provide advantages including the avoidance of space-charge blow-up.

  19. Graphitization of polymer surfaces by scanning ion irradiation

    SciTech Connect (OSTI)

    Koval, Yuri [Department of Physics, Universitt Erlangen-Nrnberg, Erwin-Rommel-Str. 1, 91058 Erlangen (Germany)

    2014-10-20

    Graphitization of polymer surfaces was performed by low-energy Ar{sup +} and He{sup +} ion irradiation. A method of scanning irradiation was implemented. It was found that by scanning ion irradiation, a significantly higher electrical conductivity in the graphitized layers can be achieved in comparison with a conventional broad-beam irradiation. The enhancement of the conductance becomes more pronounced for narrower and better collimated ion beams. In order to analyze these results in more detail, the temperature dependence of conductance of the irradiated samples was investigated. The results of measurements are discussed in terms of weak localization corrections to conductance in disordered metals. The observed effects can be explained by enlargement of graphitic patches, which was achieved with the scanning ion irradiation method.

  20. Composition analysis by scanning femtosecond laser ultraprobing (CASFLU).

    DOE Patents [OSTI]

    Ishikawa, Muriel Y.; Wood, Lowell L.; Campbell, E. Michael; Stuart, Brent C.; Perry, Michael D.

    2002-01-01

    The composition analysis by scanning femtosecond ultraprobing (CASFLU) technology scans a focused train of extremely short-duration, very intense laser pulses across a sample. The partially-ionized plasma ablated by each pulse is spectrometrically analyzed in real time, determining the ablated material's composition. The steering of the scanned beam thus is computer directed to either continue ablative material-removal at the same site or to successively remove nearby material for the same type of composition analysis. This invention has utility in high-speed chemical-elemental, molecular-fragment and isotopic analyses of the microstructure composition of complex objects, e.g., the oxygen isotopic compositions of large populations of single osteons in bone.