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Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
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1

Ultrafast scanning probe microscopy  

DOE Patents (OSTI)

An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.

Weiss, Shimon (El Cerrito, CA); Chemla, Daniel S. (Kensington, CA); Ogletree, D. Frank (El Cerrito, CA); Botkin, David (San Francisco, CA)

1995-01-01T23:59:59.000Z

2

Ultrafast scanning probe microscopy  

DOE Patents (OSTI)

An ultrafast scanning probe microscopy method is described for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample. 6 Figs.

Weiss, S.; Chemla, D.S.; Ogletree, D.F.; Botkin, D.

1995-05-16T23:59:59.000Z

3

Scanning probe microscopy in the superconductor industry  

SciTech Connect

High-temperature superconductivity and scanning probe microscopy (SPM) have much in common. Both revolutionized their scientific fields and earned Nobel prizes for the original researchers. Both represent small-scale table-top research. Finally, both have emerged from research laboratories into growing industries. Applications of scanning probe microscopy to the superconductor industry range from the straightforward to the exotic. The superior three-dimensional resolution of scanning probe microscopes makes them ideal for routine topographic imaging and profilometry of substrates and thin films. On the other hand, the more esoteric applications of SPM include spectroscopic investigations of various electromagnetic properties of superconductors above and below the critical temperature.

Howland, R.S.; Kirk, M.D. (Park Scientific Instruments (US))

1991-01-01T23:59:59.000Z

4

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

Publications | SXSPM Related Book Chapters V. Rose, J.W. Freeland, S.K. Streiffer, "New Capabilities at the Interface of X-rays and Scanning Tunneling Microscopy", in Scanning...

5

Imaging Small Molecules by Scanning Probe Microscopy Shirley Chiang  

E-Print Network (OSTI)

1 Imaging Small Molecules by Scanning Probe Microscopy Shirley Chiang Department of Physics. Ohtani, R.J. Wilson, S. Chiang, and C.M. Mate, "Scanning Tunneling Microscopy Observations of Benzene. V.M. Hallmark, S. Chiang, J.F. Rabolt, J.D. Swalen, and R.J. Wilson, "Observation of Atomic

Chiang, Shirley

6

Scanning Probe Microscopy with Spectroscopic Molecular ...  

ORNL researchers developed an innovative imaging method that possesses the imaging capability of scanning near-field ultrasound holography and the che ...

7

Open Source Scanning Probe Microscopy Control Software package GXSM  

SciTech Connect

GXSM is a full featured and modern scanning probe microscopy (SPM) software. It can be used for powerful multidimensional image/data processing, analysis, and visualization. Connected to an instrument, it is operating many different flavors of SPM, e.g., scanning tunneling microscopy and atomic force microscopy or, in general, two-dimensional multichannel data acquisition instruments. The GXSM core can handle different data types, e.g., integer and floating point numbers. An easily extendable plug-in architecture provides many image analysis and manipulation functions. A digital signal processor subsystem runs the feedback loop, generates the scanning signals, and acquires the data during SPM measurements. The programmable GXSM vector probe engine performs virtually any thinkable spectroscopy and manipulation task, such as scanning tunneling spectroscopy or tip formation. The GXSM software is released under the GNU general public license and can be obtained via the internet.

Zahl, P.; Wagner, T.; Moller, R.; Klust, A.

2010-05-01T23:59:59.000Z

8

Batch fabrication of cantilever array aperture probes for scanning near-field optical microscopy  

Science Conference Proceedings (OSTI)

We have developed a novel batch fabrication process for cantilever array aperture probes used in scanning near-field optical microscopy (SNOM). The array probes, consisting of 16 parallel cantilevers with each tip having an identical aperture, are proposed ... Keywords: Cantilever probes, Nanofabrication, Scanning near-field optical microscopy (SNOM)

Y. Zhang; K. E. Docherty; J. M. R. Weaver

2010-05-01T23:59:59.000Z

9

Electron and Scanning Probe Microscopies | U.S. DOE Office of Science (SC)  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron and Scanning Probe Microscopies Electron and Scanning Probe Microscopies Materials Sciences and Engineering (MSE) Division MSE Home About Research Areas Energy Frontier Research Centers (EFRCs) DOE Energy Innovation Hubs BES Funding Opportunities The Computational Materials and Chemical Sciences Network (CMCSN) Theoretical Condensed Matter Physics Scientific Highlights Reports and Activities Principal Investigators' Meetings BES Home Research Areas Electron and Scanning Probe Microscopies Print Text Size: A A A RSS Feeds FeedbackShare Page This research area supports basic research in condensed matter physics and materials physics using electron scattering and microscopy and scanning probe techniques. The research includes experiments and theory to understand the atomic, electronic, and magnetic structures of materials.

10

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

27.2013 27.2013 Researchers from NSLS-II visit SXSPM team at Argonne Synchrotron x-ray scanning tunneling microscopy will soon also be developed at the National Synchrotron Light Source (NSLS-II) at Brookhaven National Laboratory (BNL). In order to establish collaboration between the two National Laboratories, Drs. Evgeny Nazaretski and Hui Yan fom BNL visited Argonne to learn more about recent progress made in the SXSPM project. During the 2-day visit the teams discussed mutual scientific goals and strategies to achieve them. NSLS-II will be a new state-of-the-art, medium-energy electron storage ring at BNL designed to deliver high intensity and brightness. Construction of the NSLS-II's ring building began in March 2009. The new facility will begin operating in 2014

11

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

APS APS SXSPM News Researchers from NSLS-II visit SXSPM team at Argonne (November 27, 2013) Cummings presents invited talk at magnetism meeting (November 11, 2013) Invited talk at ACSIN-12 & ICSPM21 in Japan (November 11, 2013) Nanoscience Seminar presented at Tokyo University (November 01, 2013) Scientists study old photos for new solutions to corrosion (October 21, 2013) More News Featured Image Recent Publications Kangkang Wang, Daniel Rosenmann, Martin Holt, Robert Winarski, Saw-Wai Hla, and Volker Rose, "An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy", Rev. Sci. Instrum. 84, 063704 (2013). More SXSPM Publications Upcoming Presentations V. Rose, 41st Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-41) (Invited Speaker)

12

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

01.2013 01.2013 Nanoscience Seminar presented at Tokyo University On November 1, 2013, Volker Rose was invited to present the Nanoscience Seminar at the Institute of Solid State Physics (ISSP) of the University of Tokyo. In his seminar he discussed the physical principles of Synchrotron X-ray Scanning Tunneling Microscopy (SXSTM) as well as the recent progress made by his team at the Advanced Photon Source. He was invited by Prof. Yukio Hasegawa, who himself conducts SXSTM experiment at the Photon Factory in Tsukuba, Japan. The ISSP serves as the central laboratory of materials science in Japan equipped with state-of-art facilities. It was relocated to the new campus in Kashiwa of the University of Tokyo in 2000 after the 43 years of activities at the Roppongi campus in downtown Tokyo. Here ISSP is focusing

13

Development of New Methods in Scanning Probe Microscopy for Lignocellulosic Biomass Characterization  

E-Print Network (OSTI)

Methods Development of New Methods in Scanning Probe Microscopy for Lignocellulosic Biomass implicated in recalcitrance is important for utili- zation of lignocellulosic biomass in the world new technologies to explore the ultrastructure of biomass at nanoscale.4 Mode-synthesizing atomic

14

Monitoring charge storage processes in nanoscale oxides using electrochemical scanning probe microscopy.  

Science Conference Proceedings (OSTI)

Advances in electrochemical energy storage science require the development of new or the refinement of existing in situ probes that can be used to establish structure - activity relationships for technologically relevant materials. The drive to develop reversible, high capacity electrodes from nanoscale building blocks creates an additional requirement for high spatial resolution probes to yield information of local structural, compositional, and electronic property changes as a function of the storage state of a material. In this paper, we describe a method for deconstructing a lithium ion battery positive electrode into its basic constituents of ion insertion host particles and a carbon current collector. This model system is then probed in an electrochemical environment using a combination of atomic force microscopy and tunneling spectroscopy to correlate local activity with morphological and electronic configurational changes. Cubic spinel Li{sub 1+x}Mn{sub 2-x}O{sub 4} nanoparticles are grown on graphite surfaces using vacuum deposition methods. The structure and composition of these particles are determined using transmission electron microscopy and Auger microprobe analysis. The response of these particles to initial de-lithiation, along with subsequent electrochemical cycling, is tracked using scanning probe microscopy techniques in polar aprotic electrolytes (lithium hexafluorophosphate in ethylene carbonate:diethylcarbonate). The relationship between nanoparticle size and reversible ion insertion activity will be a specific focus of this paper.

Zavadil, Kevin Robert; Lu, Ping; Huang, Jian Yu

2010-11-01T23:59:59.000Z

15

Principal Component Analysis of Spectroscopic Imaging Data in Scanning Probe Microscopy  

SciTech Connect

The approach for data analysis in band excitation family of scanning probe microscopies based on principal component analysis (PCA) is explored. PCA utilizes the similarity between spectra within the image to select the relevant response components. For small signal variations within the image, the PCA components coincide with the results of deconvolution using simple harmonic oscillator model. For strong signal variations, the PCA allows effective approach to rapidly process, de-noise and compress the data. The extension of PCA for correlation function analysis is demonstrated. The prospects of PCA as a universal tool for data analysis and representation in multidimensional SPMs are discussed.

Jesse, Stephen [ORNL; Kalinin, Sergei V [ORNL

2009-01-01T23:59:59.000Z

16

Scanning Hall Probe Microscopy of Magnetic Vortices inVery Underdoped yttrium-barium-copper-oxide  

Science Conference Proceedings (OSTI)

Since their discovery by Bednorz and Mueller (1986), high-temperature cuprate superconductors have been the subject of intense experimental research and theoretical work. Despite this large-scale effort, agreement on the mechanism of high-T{sub c} has not been reached. Many theories make their strongest predictions for underdoped superconductors with very low superfluid density n{sub s}/m*. For this dissertation I implemented a scanning Hall probe microscope and used it to study magnetic vortices in newly available single crystals of very underdoped YBa{sub 2}Cu{sub 3}O{sub 6+x} (Liang et al. 1998, 2002). These studies have disproved a promising theory of spin-charge separation, measured the apparent vortex size (an upper bound on the penetration depth {lambda}{sub ab}), and revealed an intriguing phenomenon of ''split'' vortices. Scanning Hall probe microscopy is a non-invasive and direct method for magnetic field imaging. It is one of the few techniques capable of submicron spatial resolution coupled with sub-{Phi}{sub 0} (flux quantum) sensitivity, and it operates over a wide temperature range. Chapter 2 introduces the variable temperature scanning microscope and discusses the scanning Hall probe set-up and scanner characterizations. Chapter 3 details my fabrication of submicron GaAs/AlGaAs Hall probes and discusses noise studies for a range of probe sizes, which suggest that sub-100 nm probes could be made without compromising flux sensitivity. The subsequent chapters detail scanning Hall probe (and SQUID) microscopy studies of very underdoped YBa{sub 2}Cu{sub 3}O{sub 6+x} crystals with T{sub c} {le} 15 K. Chapter 4 describes two experimental tests for visons, essential excitations of a spin-charge separation theory proposed by Senthil and Fisher (2000, 2001b). We searched for predicted hc/e vortices (Wynn et al. 2001) and a vortex memory effect (Bonn et al. 2001) with null results, placing upper bounds on the vison energy inconsistent with the theory. Chapter 5 discusses imaging of isolated vortices as a function of T{sub c}. Vortex images were fit with theoretical magnetic field profiles in order to extract the apparent vortex size. The data for the lowest T{sub c}'s (5 and 6.5 K) show some inhomogeneity and suggest that {lambda}{sub ab} might be larger than predicted by the T{sub c} {proportional_to} n{sub s}(0)/m* relation first suggested by results of Uemura et al. (1989) for underdoped cuprates. Finally, Chapter 6 examines observations of apparent ''partial vortices'' in the crystals. My studies of these features indicate that they are likely split pancake vortex stacks. Qualitatively, these split stacks reveal information about pinning and anisotropy in the samples. Collectively these magnetic imaging studies deepen our knowledge of cuprate superconductivity, especially in the important regime of low superfluid density.

Guikema, Janice Wynn; /SLAC, SSRL

2005-12-02T23:59:59.000Z

17

Atomic-scale properties of semiconductor heterostructures probed by scanning tunneling microscopy  

SciTech Connect

The engineering of advanced semiconductor heterostructure materials and devices requires a detailed understanding of, and control over, the structure and properties of semiconductor materials and devices at the atomic to nanometer scale. Cross-sectional scanning tunneling microscopy has emerged as a unique and powerful method to characterize structural morphology and electronic properties in semiconductor epitaxial layers and device structures at these length scales. The basic experimental techniques in cross-sectional scanning tunneling microscopy are described, and some representative applications to semiconductor heterostructure characterization drawn from recent investigations in the authors laboratory are discussed. Specifically, they describe some recent studies of InP/InAsP and InAsP/InAsSb heterostructures in which nanoscale compositional clustering has been observed and analyzed.

Yu, E.T.; Zuo, S.L.; Bi, W.G.; Tu, C.W. [Univ. of California, San Diego, La Jolla, CA (United States). Dept. of Electrical and Computer Engineering; Biefeld, R.M.; Allerman, A.A. [Sandia National Labs., Albuquerque, NM (United States)

1998-05-01T23:59:59.000Z

18

Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy  

DOE Patents (OSTI)

An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.

Jesse, Stephen; Kalinin, Sergei V; Nikiforov, Maxim P

2013-07-09T23:59:59.000Z

19

Combining In-Situ Buffer-Layer-Assisted-Growth with Scanning Probe Microscopy for Formation and Study of Supported Model Catalysts  

NLE Websites -- All DOE Office Websites (Extended Search)

STM images showing the morphology of BaO film (7 ML-left and STM images showing the morphology of BaO film (7 ML-left and 80 ML-right) formed by the direct evaporation of the BaO. EMSL Research and Capability Development Proposals Combining In Situ Buffer-Layer-Assisted-Growth with Scanning Probe Microscopy for Formation and Study of Supported Model Catalysts Project start date: Spring 2008 EMSL Lead Investigator: Igor Lyubinetsky Microscopy Group, EMSL, PNNL Co-investigators: Yingge Du Spectroscopy and Diffraction Group, EMSL, PNNL Wayne Goodman Department of Chemistry, Texas A&M University, College Station, Texas The objective of the project is to implement in situ advanced buffer-layer-assisted growth (BLAG) technique by combining EMSL's ultra-high vacuum scanning probe microscopy (UHV SPM) and

20

Scanning Electron Microscopy (SEM)  

Science Conference Proceedings (OSTI)

...The scanning electron microscope provides a valuable combination of high resolution imaging, elemental analysis, and recently, crystallographic analysis: Imaging of features as small as sim 10 nm or less, roughly 100 times smaller than can be seen with...

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


21

INFLUENCE OF FILM STRUCTURE AND LIGHT ON CHARGE TRAPPING AND DISSIPATION DYNAMICS IN SPUN-CAST ORGANIC THIN-FILM TRANSISTORS MEASURED BY SCANNING KELVIN PROBE MICROSCOPY  

SciTech Connect

Herein, time-dependent scanning Kelvin probe microscopy of solution processed organic thin film transistors (OTFTs) reveals a correlation between film microstructure and OTFT device performance with the location of trapped charge within the device channel. The accumulation of the observed trapped charge is concurrent with the decrease in I{sub SD} during operation (V{sub G}=-40 V, V{sub SD}= -10 V). We discuss the charge trapping and dissipation dynamics as they relate to the film structure and show that application of light quickly dissipates the observed trapped charge.

Teague, L.; Moth, M.; Anthony, J.

2012-05-03T23:59:59.000Z

22

Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis  

Science Conference Proceedings (OSTI)

State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical mappings with excellent sensitivity and spatial resolution. Several important artifacts however arise from the fact that SIMS 3D mapping does not take into account the surface topography of the sample. In order to correct these artifacts, we have integrated a specially developed scanning probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new high-precision sample stage, a scanner with a range of 100 {mu}m in x and y direction, and a dedicated SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy modes. Topographical information gained from AFM measurements taken before, during, and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D reconstruction using the software program 'SARINA,' which was developed for this first combined SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMS-SPM approach.

Wirtz, Tom; Fleming, Yves; Gerard, Mathieu [Department 'Science and Analysis of Materials' (SAM), Centre de Recherche Public, Gabriel Lippmann, 41 rue du Brill, L-4422 Belvaux (Luxembourg); Gysin, Urs; Glatzel, Thilo; Meyer, Ernst [Department of Physics, Universitaet Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland); Wegmann, Urs [Department of Physics, Universitaet Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland); Ferrovac GmbH, Thurgauerstr. 72, CH-8050 Zuerich (Switzerland); Maier, Urs [Ferrovac GmbH, Thurgauerstr. 72, CH-8050 Zuerich (Switzerland); Odriozola, Aitziber Herrero; Uehli, Daniel [SPECS Zurich GmbH, Technoparkstr. 1, CH-8005 Zuerich (Switzerland)

2012-06-15T23:59:59.000Z

23

Neural network characterization of scanning electron microscopy  

Science Conference Proceedings (OSTI)

A scanning electron microscope (SEM) is a sophisticated equipment employed for fine imaging of processed film surfaces. In this study, a prediction model of scanning electron microscopy was constructed by using a generalized regression neural network ... Keywords: generalized regression neural network, genetic algorithm, model, scanning electron microscope, statistical experiment

Sanghee Kwon; Donghwan Kim; Byungwhan Kim

2008-07-01T23:59:59.000Z

24

Scanning Transmission Electron Microscopy Investigations of Complex...  

NLE Websites -- All DOE Office Websites (Extended Search)

Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of...

25

Open-loop Band excitation Kelvin Probe Force Microscopy  

Science Conference Proceedings (OSTI)

A multidimensional scanning probe microscopy approach for quantitative, cross-talk free mapping of surface electrostatic properties is demonstrated. Open-loop band excitation Kelvin probe force microscopy (OL BE KPFM) probes the full response-frequency-potential surface at each pixel at standard imaging rates. The subsequent analysis reconstructs work function, tip surface capacitance gradient and resonant frequency maps, obviating feedback-related artifacts. OL BE KPFM imaging is demonstrated for several materials systems with topographic, potential and combined contrast. This approach combines the features of both frequency and amplitude KPFM and allows complete decoupling of topographic and voltage contributions to the KPFM signal.

Guo, Senli [ORNL; Kalinin, Sergei V [ORNL; Jesse, Stephen [ORNL

2012-01-01T23:59:59.000Z

26

Scanning magnetoresistance microscopy of atom chips  

Science Conference Proceedings (OSTI)

Surface based geometries of microfabricated wires or patterned magnetic films can be used to magnetically trap and manipulate ultracold neutral atoms or Bose-Einstein condensates. We investigate the magnetic properties of such atom chips using a scanning magnetoresistive (MR) microscope with high spatial resolution and high field sensitivity. By comparing MR scans of a permanent magnetic atom chip to field profiles obtained using ultracold atoms, we show that MR sensors are ideally suited to observe small variations of the magnetic field caused by imperfections in the wires or magnetic materials which ultimately lead to fragmentation of ultracold atom clouds. Measurements are also provided for the magnetic field produced by a thin current-carrying wire with small geometric modulations along the edge. Comparisons of our measurements with a full numeric calculation of the current flow in the wire and the subsequent magnetic field show excellent agreement. Our results highlight the use of scanning MR microscopy as a convenient and powerful technique for precisely characterizing the magnetic fields produced near the surface of atom chips.

Volk, M.; Whitlock, S.; Wolff, C. H.; Hall, B. V.; Sidorov, A. I. [ARC Centre of Excellence for Quantum-Atom Optics and Centre for Atom Optics and Ultrafast Spectroscopy, Swinburne University of Technology, Hawthorn, Victoria 3122 (Australia)

2008-02-15T23:59:59.000Z

27

Scanned Probe Microscopy Measurements and Standards  

Science Conference Proceedings (OSTI)

... enable high-throughput quantification for gas absorption in energy materials for two important tasks: hydrogen storage and carbon sequestration. ...

2013-03-15T23:59:59.000Z

28

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

8.31.2013 Seminar presented at Ohio University APS From August 28-30, 2013, Volker Rose was invited by Prof. Saw-Wai Hla for a research visit at Ohio University (OU). Ohio...

29

Designing Advanced Scanning Probe Microscopy Instruments  

Science Conference Proceedings (OSTI)

... The UHV insert is cooled via He exchange gas to avoid vibrations from the boiling of the liquid He in the main bath of the cryostat. ...

2011-09-22T23:59:59.000Z

30

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

(September 30, 2013) Shirato presents invited talk at SPIE conference (September 02, 2013) August Seminar presented at Ohio University (August 31, 2013) Training...

31

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

Beamtime 2013 APS | SXSPM | Beamtime 2013 Downlaod PDF SXSPM | Beamtime 2012 APS | SXSPM | Beamtime 2012 Downlaod PDF...

32

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

16.2013 Training next-generation scientists at NX School APS The twelfth annual National Neutron and X-ray Scattering School took place from August 10-24, 2013 at Argonne and Oak...

33

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

02.2013 Shirato presents invited talk at SPIE conference APS The 2013 SPIE Optics and Photonics conference was held at San Diego Convention Center from August 25-29, 2013. It is...

34

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

7.08.2013 Visiting graduate student Jan Meyburg spends summer at Argonne APS Jan Philipp Meyburg is a graduate student in chemistry at the University of Duisburg-Essen. He joins...

35

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

30.2013 Alan Alda Center for Communicating Science workshop APS APS On September 26-28, 2013, Alan Alda, The Kavli Foundation, and the Alan Alda Center for Communicating Science...

36

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

Presentations UPCOMING PRESENTATIONS V. Rose, The Institute for Solid State Physics Nano Science Seminar (Invited Speaker) The University of Tokyo, Japan (October 31-November 2,...

37

Scanning Surface Potential Microscopy of Spore Adhesion on Surfaces  

SciTech Connect

The adhesion of spores of Bacillus anthracis - the cause of anthrax and a likely biological threat - to solid surfaces is an important consideration in cleanup after an accidental or deliberate release. However, because of safety concerns, directly studying B. anthracis spores with advanced instrumentation is problematic. As a first step, we are examining the electrostatic potential of Bacillus thuringiensis (Bt), which is a closely related species that is often used as a simulant to study B. anthracis. Scanning surface potential microscopy (SSPM), also known as Kelvin probe force microscopy (KPFM), was used to investigate the influence of relative humidity (RH) on the surface electrostatic potential of Bt that had adhered to silica, mica, or gold substrates. AFM/SSPM side-by-side images were obtained separately in air, at various values of RH, after an aqueous droplet with spores was applied on each surface and allowed to dry before measurements. In the SSPM images, a negative potential on the surface of the spores was observed compared with that of the substrates. The surface potential decreased as the humidity increased. Spores were unable to adhere to a surface with an extremely negative potential, such as mica.

Lee, Ida [University of Tennessee, Knoxville (UTK); Chung, Eunhyea [Georgia Institute of Technology; Kweon, Hyojin [Georgia Institute of Technology; Yiacoumi, Sotira [Georgia Institute of Technology; Tsouris, Costas [ORNL

2012-01-01T23:59:59.000Z

38

Atmospheric pressure scanning transmission electron microscopy  

SciTech Connect

Scanning transmission electron microscope (STEM) images of gold nanoparticles (2.1 nm average diameter) at atmospheric pressure have been recorded through a 0.36 mm thick mixture of CO, O2 and He. This was accomplished using a reaction cell consisting of two electron-transparent silicon nitride membranes mounted on a specially designed specimen rod. Gas flow occurred through plastic tubing from the outside of the microscope to the specimen region and back. Gold nanoparticles of a full width half maximum diameter of 1.0 nm were visible above the background noise and the achieved resolution was 0.5 nm in accordance with calculations of the beam broadening.

De Jonge, Niels [ORNL; Veith, Gabriel M [ORNL; Bigelow, Wilbur C [ORNL

2010-01-01T23:59:59.000Z

39

Atom Probe Tomography and Transmission Electron Microscopy ...  

Science Conference Proceedings (OSTI)

Abstract Scope, Atom probe tomography (APT) and analytical transmission .... of a Leaking Type 316 Socket Weld in a Boron Injection Tank Sampling Line.

40

Scanning Transmission Electron Microscopy Investigations of Complex Oxides  

NLE Websites -- All DOE Office Websites (Extended Search)

Scanning Transmission Electron Microscopy Investigations of Complex Oxides Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of Chemistry, University of South Carolina High-Angle-Annular-Dark-Field/Scanning Transmission Electron Microscopy (HAADF/STEM) is a technique uniquely suited for detailed studies of the structure and composition of complex oxides. The HAADF detector collects electrons which have interact inelastically with the potentials of the atoms in the specimen and therefore resembles the better known Z2 (Z is atomic number) Rutherford scattering. One class of important catalysts consists of bronzes based on pentagonal {Mo6O21} building units; these include Mo5O14 and Mo17O47. In the last 20 years, new materials doped with

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


41

Instrument Series: Microscopy Atom Probe The LEAP  

NLE Websites -- All DOE Office Websites (Extended Search)

Atom Probe Atom Probe The LEAP ® 4000 XHR local electrode atom probe tomography instrument enabled the first- ever comprehensive and accurate 3-D chemical imaging studies of low electrical conductivity materials, such as ceramics, semiconductors and oxides. The LEAP capability is assisting EMSL's efforts to further scientific advancements in interface analysis and microstructural characterization, providing a new tool for understanding the relationship between the nanoscale structure of materials and their macroscopic properties. Research Applications Geochemistry - Studying chemical processes that compose rocks and soils has long been used to determine matter cycles and transport in the environment, which supports critical EMSL research in areas including bioremediation.

42

Modulated microwave microscopy and probes used therewith  

Science Conference Proceedings (OSTI)

A microwave microscope including a probe tip electrode vertically positionable over a sample and projecting downwardly from the end of a cantilever. A transmission line connecting the tip electrode to the electronic control system extends along the cantilever and is separated from a ground plane at the bottom of the cantilever by a dielectric layer. The probe tip may be vertically tapped near or at the sample surface at a low frequency and the microwave signal reflected from the tip/sample interaction is demodulated at the low frequency. Alternatively, a low-frequency electrical signal is also a non-linear electrical element associated with the probe tip to non-linearly interact with the applied microwave signal and the reflected non-linear microwave signal is detected at the low frequency. The non-linear element may be semiconductor junction formed near the apex of the probe tip or be an FET formed at the base of a semiconducting tip.

Lai, Keji; Kelly, Michael; Shen, Zhi-Xun

2012-09-11T23:59:59.000Z

43

Scanning transmission electron microscopy of gate stacks with HfO2 dielectrics and TiN electrodes  

E-Print Network (OSTI)

Scanning transmission electron microscopy of gate stacksEELS) in scanning transmission electron microscopy were usedWe use scanning transmission electron microscopy (STEM)

Agustin, Melody P.; Fonseca, Leo R. C.; Hooker, Jacob C.; Stemmer, Susanne

2005-01-01T23:59:59.000Z

44

Instrument Series: Microscopy Ultra-High Vacuum, Low- Temperature Scanning  

NLE Websites -- All DOE Office Websites (Extended Search)

Low- Low- Temperature Scanning Probe Microscope EMSL's ultra-high vacuum, low-temperature scanning probe microscope instrument, or UHV LT SPM, is the preeminent system dedicated to surface chemistry and physics at low temperatures down to 5 K. Operating at low temperatures provides high mechanical stability, superior vacuum conditions, and negligible drift for long-term experiments. With thermal diffusion being entirely suppressed, stable imaging becomes possible even for weakly bound species. The system is primarily used for probing single-site chemical reactivity, while the combination with a hyperthermal molecular beam allows the study of important chemical processes at energies corresponding to the operational temperatures well beyond typical UHV studies. The LT SPM provides

45

Visualizing Macromolecular Complexes with In Situ Liquid Scanning Transmission Electron Microscopy  

SciTech Connect

A central focus of biological research is understanding the structure/function relationship of macromolecular protein complexes. Yet conventional transmission electron microscopy techniques are limited to static observations. Here we present the first direct images of purified macromolecular protein complexes using in situ liquid scanning transmission electron microscopy. Our results establish the capability of this technique for visualizing the interface between biology and nanotechnology with high fidelity while also probing the interactions of biomolecules within solution. This method represents an important advancement towards allowing future high-resolution observations of biological processes and conformational dynamics in real-time.

Evans, James E.; Jungjohann, K. L.; Wong, Peony C. K.; Chiu, Po-Lin; Dutrow, Gavin H.; Arslan, Ilke; Browning, Nigel D.

2012-11-01T23:59:59.000Z

46

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

G. R. et al. Scanning transmission X-ray microscopy: A newwith the scanning transmission X-ray microscope at BESSY II.T. et al. Scanning transmission X-ray microscopy imaging of

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

47

The theory and practice of high resolution scanning electron microscopy  

Science Conference Proceedings (OSTI)

Recent advances in instrumentation have produced the first commercial examples of what can justifiably be called High Resolution Scanning Electron Microscopes. The key components of such instruments are a cold field emission gun, a small-gap immersion probe-forming lens, and a clean dry-pumped vacuum. The performance of these microscopes is characterized by several major features including a spatial resolution, in secondary electron mode on solid specimens, which can exceed 1nm on a routine basis; an incident probe current density of the order of 10{sup 6} amps/cm{sup 2}; and the ability to maintain these levels of performance over an accelerating voltage range of from 1 to 30keV. This combination of high resolution, high probe current, low contamination and flexible electron-optical conditions provides many new opportunitites for the application of the SEM to materials science, physics, and the life sciences. 27 refs., 14 figs.

Joy, D.C. (Tennessee Univ., Knoxville, TN (USA) Oak Ridge National Lab., TN (USA))

1990-01-01T23:59:59.000Z

48

Instrument Series: Microscopy Aberration-Corrected Scanning/Transmission  

NLE Websites -- All DOE Office Websites (Extended Search)

Aberration-Corrected Aberration-Corrected Scanning/Transmission Electron Microscope EMSL's aberration-corrected Titan 80-300(tm) scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials. Research Applications

49

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

Science Conference Proceedings (OSTI)

Scanning transmission x-ray microscopy (STXM) combines x-ray microscopy and near edge x-ray absorption fine structure spectroscopy (NEXAFS). This combination provides spatially resolved bonding and oxidation state information. While there are reviews relevant to STXM/NEXAFS applications in other environmental fields (and magnetic materials) this chapter focuses on atmospheric aerosols. It provides an introduction to this technique in a manner approachable to non-experts. It begins with relevant background information on synchrotron radiation sources and a description of NEXAFS spectroscopy. The bulk of the chapter provides a survey of STXM/NEXAFS aerosol studies and is organized according to the type of aerosol investigated. The purpose is to illustrate the current range and recent growth of scientific investigations employing STXM-NEXAFS to probe atmospheric aerosol morphology, surface coatings, mixing states, and atmospheric processing.

Moffet, Ryan C.; Tivanski, Alexei V.; Gilles, Mary K.

2011-01-20T23:59:59.000Z

50

Scanning tunneling optical resonance microscopy applied to indium arsenide quantum dot structures.  

E-Print Network (OSTI)

??The technique of Scanning Tunneling Optical Resonance Microscopy (STORM) has been investigated for use on nanostructures. It has been demonstrated as a viable technique to… (more)

Byrnes, Daniel P.

2008-01-01T23:59:59.000Z

51

A PRACTICAL GUIDE TO SCANNING PROBE MICROSCOPY Authors (first edition)  

E-Print Network (OSTI)

. This indicates that the PZN-5.5PT sample did not become depoled when lowering the applied electric field to 0

Ortiz, Christine

52

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

0.21.2013 0.21.2013 Scientists study old photos for new solutions to corrosion Each week, Viewpoints features interviews with guests that have expertise and real-word experience regarding specific issues. The program is aired on over 450 radio stations throughout the country. This weeks featured guests are Volker Rose, Physicist with the Advanced Photon Source and Center for Nanoscale Materials, Argonne National Laboratory, (www.anl.gov). and Edward Vicenzi, Research scientist at the Smithsonian Institution's Museum Conservation Institute, (www.si.edu/mci). Material failure caused by corrosion is dangerous and costs billions of dollars every year. What if you could figure out how to prevent and treat corrosion at the tiniest "nano" level before it has a chance to cause a

53

Band Excitation Method Applicable to Scanning Probe Microscopy ...  

Vehicles and Fuels; Wind Energy; Partners (27) Visual Patent Search; Success Stories; ... It is relevant to all SPM manufacturers and can yield data about a sample ...

54

Rapid Functional Recognition Imaging in Scanning Probe Microscopy  

... Principal component maps of the spectrum image and (d) average signal. Summary: Technology Description

55

Band excitation method applicable to scanning probe microscopy ...  

Solar Photovoltaic; Solar Thermal; Startup America; ... signal having finite and predefined amplitude and phase spectrum in at least a first ...

56

Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device  

Science Conference Proceedings (OSTI)

A high-speed direct electron detection system is introduced to the field of transmission electron microscopy and applied to strain measurements in semiconductor nanostructures. In particular, a focused electron probe with a diameter of 0.5 nm was scanned over a fourfold quantum layer stack with alternating compressive and tensile strain and diffracted discs have been recorded on a scintillator-free direct electron detector with a frame time of 1 ms. We show that the applied algorithms can accurately detect Bragg beam positions despite a significant point spread each 300 kV electron causes during detection on the scintillator-free camera. For millisecond exposures, we find that strain can be measured with a precision of 1.3 Multiplication-Sign 10{sup -3}, enabling, e.g., strain mapping in a 100 Multiplication-Sign 100 nm{sup 2} region with 0.5 nm resolution in 40 s.

Mueller, Knut; Rosenauer, Andreas [Institut fuer Festkoerperphysik, Universitaet Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany); Ryll, Henning; Ordavo, Ivan; Ihle, Sebastian; Soltau, Heike [PNSensor GmbH, Roemerstrasse 28, 80803 Muenchen (Germany); Strueder, Lothar [Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany); Volz, Kerstin [Materials Science Center and Faculty of Physics, Philipps Universitaet Marburg, Hans-Meerwein-Strasse, 35032 Marburg (Germany); Zweck, Josef [Institut fuer Experimentelle und Angewandte Physik, Universitaet Regensburg, Universitaetsstrasse 31, 93040 Regensburg (Germany)

2012-11-19T23:59:59.000Z

57

Using Scanning Acoustic Microscopy to Study Subsurface Defects ...  

Science Conference Proceedings (OSTI)

... surface (found during periodic inspections during the course of the experiments). ... Scanning—A Review," Proceedings of the IEEE, 67 (8) (August 1979), pp.

58

In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry  

Science Conference Proceedings (OSTI)

Oxides and their tailored structures are at the heart of electrochemical energy storage technologies and advances in understanding and controlling the dynamic behaviors in the complex oxides, particularly at the interfaces, during electrochemical processes will catalyze creative design concepts for new materials with enhanced and better-understood properties. Such knowledge is not accessible without new analytical tools. New innovative experimental techniques are needed for understanding the chemistry and structure of the bulk and interfaces, more importantly how they change with electrochemical processes in situ. Analytical Transmission Electron Microscopy (TEM) is used extensively to study electrode materials ex situ and is one of the most powerful tools to obtain structural, morphological, and compositional information at nanometer scale by combining imaging, diffraction and spectroscopy, e.g., EDS (energy dispersive X-ray spectrometry) and Electron Energy Loss Spectrometry (EELS). Determining the composition/structure evolution upon electrochemical cycling at the bulk and interfaces can be addressed by new electron microscopy technique with which one can observe, at the nanometer scale and in situ, the dynamic phenomena in the electrode materials. In electrochemical systems, for instance in a lithium ion battery (LIB), materials operate under conditions that are far from equilibrium, so that the materials studied ex situ may not capture the processes that occur in situ in a working battery. In situ electrochemical operation in the ultra-high vacuum column of a TEM has been pursued by two major strategies. In one strategy, a 'nano-battery' can be fabricated from an all-solid-state thin film battery using a focused ion beam (FIB). The electrolyte is either polymer based or ceramic based without any liquid component. As shown in Fig. 1a, the interfaces between the active electrode material/electrolyte can be clearly observed with TEM imaging, in contrast to the composite electrodes/electrolyte interfaces in conventional lithium ion batteries, depicted in Fig.1b, where quantitative interface characterization is extremely difficult if not impossible. A second strategy involves organic electrolyte, though this approach more closely resembles the actual operation conditions of a LIB, the extreme volatility In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry by Ying Shirley Meng, Thomas McGilvray, Ming-Che Yang, Danijel Gostovic, Feng Wang, Dongli Zeng, Yimei Zhu, and Jason Graetz of the organic electrolytes present significant challenges for designing an in situ cell that is suitable for the vacuum environment of the TEM. Significant progress has been made in the past few years on the development of in situ electron microscopy for probing nanoscale electrochemistry. In 2008, Brazier et al. reported the first cross-section observation of an all solid-state lithium ion nano-battery by TEM. In this study the FIB was used to make a 'nano-battery,' from an all solid-state battery prepared by pulsed laser deposition (PLD). In situ TEM observations were not possible at that time due to several key challenges such as the lack of a suitable biasing sample holder and vacuum transfer of sample. In 2010, Yamamoto et al. successfully observed changes of electric potential in an all-solid-state lithium ion battery in situ with electron holography (EH). The 2D potential distribution resulting from movement of lithium ions near the positive-electrode/electrolyte interface was quantified. More recently Huang et al. and Wang et al. reported the in situ observations of the electrochemical lithiation of a single SnO{sub 2} nanowire electrode in two different in situ setups. In their approach, a vacuum compatible ionic liquid is used as the electrolyte, eliminating the need for complicated membrane sealing to prevent the evaporation of carbonate based organic electrolyte into the TEM column. One main limitation of this approach is that EELS spectral imaging is not possible due to the high plasmon signal of the ionic li

Graetz J.; Meng, Y.S.; McGilvray, T.; Yang, M.-C.; Gostovic, D.; Wang, F.; Zeng, D.; Zhu, Y.

2011-10-31T23:59:59.000Z

59

Near-field Microwave Scanning Probe Imaging of Conductivity Inhomogeneities in CVD Graphene  

SciTech Connect

We have performed near-field scanning microwave microscopy (SMM) of graphene grown by chemical vapor deposition. Due to the use of probe-sample capacitive coupling and a relatively high ac frequency of a few GHz, this scanning probe method allows mapping of local conductivity without a dedicated counter electrode, with a spatial resolution of about 50 nm. Here, the coupling was enabled by atomic layer deposition of alumina on top of graphene, which in turn enabled imaging both large-area films, as well as micron-sized islands, with a dynamic range covering a low sheet resistance of a metal film and a high resistance of highly disordered graphene. The structures of graphene grown on Ni films and Cu foils are explored, and the effects of growth conditions are elucidated. We present a simple general scheme for interpretation of the contrast in the SMM images of our graphene samples and other two-dimensional conductors, which is supported by extensive numerical finite-element modeling. We further demonstrate that combination of the SMM and numerical modeling allows quantitative information about the sheet resistance of graphene to be obtained, paving the pathway for characterization of graphene conductivity with a sub-100 nm special resolution.

Tselev, Alexander [ORNL; Lavrik, Nickolay V [ORNL; Vlassiouk, Ivan V [ORNL; Briggs, Dayrl P [ORNL; Rutgers, Maarten [Asylum Research, Santa Barbara, CA; Proksch, Roger [Asylum Research, Santa Barbara, CA; Kalinin, Sergei V [ORNL

2012-01-01T23:59:59.000Z

60

Development of a microfluidic device for patterning multiple species by scanning probe lithography  

E-Print Network (OSTI)

Scanning Probe Lithography (SPL) is a versatile nanofabrication platform that leverages microfluidic “ink” delivery systems with Scanning Probe Microscopy (SPM) for generating surface-patterned chemical functionality on the sub-100 nm length scale. One of the prolific SPL techniques is Dip Pen Nanolithography™ (DPN™). High resolution, multiplexed registration and parallel direct-write capabilities make DPN (and other SPL techniques) a power tool for applications that are envisioned in micro/nano-electronics, molecular electronics, catalysis, cryptography (brand protection), combinatorial synthesis (nano-materials discovery and characterization), biological recognition, genomics, and proteomics. One of the greatest challenges for the successful performance of the DPN process is the delivery of multiple inks to the scanning probe tips for nano-patterning. The purpose of the present work is to fabricate a microfluidic ink delivery device (called “Centiwell”) for DPN (and other SPL) applications. The device described in this study maximizes the number of chemical species (inks) for nanofabrication that can be patterned simultaneously by DPN to conform the industrial standards for fluid handling for biochemical assays (e.g., genomic and proteomic). Alternate applications of Centiwell are also feasible for the various envisioned applications of DPN (and other SPL techniques) that were listed above. The Centiwell consists of a two-dimensional array of 96 microwells that are bulk micromachined on a silicon substrate. A thermoelectric module is attached to the back side of the silicon substrate and is used to cool the silicon substrate to temperatures below the dew point. By reducing the temperature of the substrate to below the dew point, water droplets are condensed in the microwell array. Microbeads of a hygroscopic material (e.g., poly-ethylene glycol) are dispensed into the microwells to prevent evaporation of the condensed water. Furthermore, since poly-ethylene glycol (PEG) is water soluble, it forms a solution inside the microwells which is subsequently used as the ink for the DPN process. The delivery of the ink to the scanning probe tip is performed by dipping the tip (or multiple tips in an array) into the microwells containing the PEG solution. This thesis describes the various development steps for the Centiwell. These steps include the mask design, the bulk micromachining processes explored for the micro-fabrication of the microwell array, the thermal design calculations performed for the selection of the commercially available thermoelectric coolers, the techniques explored for the synthesis of the PEG microbeads, and the assembly of all the components for integration into a functional Centiwell. Finally, the successful implementation of the Centiwell for nanolithography of PEG solutions is also demonstrated.

Rivas Cardona, Juan Alberto

2006-08-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
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they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


61

Scanning mid-IR-laser microscopy: an efficient tool for materials studies in silicon-based photonics and photovoltaics  

E-Print Network (OSTI)

A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in the industries of microelectronics and photovoltaics. The basis for this development was laid with a wide cycle of investigations on low-angle mid-IR-light scattering in semiconductors. The essence of the technical idea was to apply the dark-field method for spatial filtering of the scattered light in the scanning mid-IR-laser microscope together with the local photoexcitation of excess carriers within a small domain in a studied sample, thus forming an artificial source of scattering of the probe IR light for the recombination contrast imaging of defects. The current paper presents three contrasting examples of application of the above technique for defect visualization in silicon-based materials designed for photovoltaics and photonics which demonstrate that this...

Astafiev, O V; Yuryev, V A; 10.1016/S0022-0248(99)00711-3

2011-01-01T23:59:59.000Z

62

Method for imaging liquid and dielectric materials with scanning polarization force microscopy  

DOE Patents (OSTI)

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

Hu, Jun (Berkeley, CA); Ogletree, D. Frank (El Cerrito, CA); Salmeron, Miguel (El Cerrito, CA); Xiao, Xudong (Kowloon, CN)

1999-01-01T23:59:59.000Z

63

Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy  

DOE Patents (OSTI)

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

1998-04-28T23:59:59.000Z

64

Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy  

SciTech Connect

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

Hu, Jun (Berkeley, CA); Ogletree, D. Frank (El Cerrito, CA); Salmeron, Miguel (El Cerrito, CA); Xiao, Xudong (Kowloon, CN)

1998-01-01T23:59:59.000Z

65

Method for imaging liquid and dielectric materials with scanning polarization force microscopy  

DOE Patents (OSTI)

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

1999-03-09T23:59:59.000Z

66

Analytical Microscopy  

DOE Green Energy (OSTI)

In the Analytical Microscopy group, within the National Center for Photovoltaic's Measurements and Characterization Division, we combine two complementary areas of analytical microscopy--electron microscopy and proximal-probe techniques--and use a variety of state-of-the-art imaging and analytical tools. We also design and build custom instrumentation and develop novel techniques that provide unique capabilities for studying materials and devices. In our work, we collaborate with you to solve materials- and device-related R&D problems. This sheet summarizes the uses and features of four major tools: transmission electron microscopy, scanning electron microscopy, the dual-beam focused-ion-beam workstation, and scanning probe microscopy.

Not Available

2006-06-01T23:59:59.000Z

67

Characterization of interfacial bonding using a scanning Kelvin probe  

SciTech Connect

Interfaces play a crucial role in determining the ultimate properties and service life of coating and film materials. However, the characterization and measurement of interfacial bonding, in particular of the local strength, is difficult. The high sensitivity of the electron work function (EWF) to surface conditions has attracted increasing interest in applications of the Kelvin probing technique to investigate the mechanical behavior of materials. In this study, the Kelvin method was used to characterize the interfacial bond formed between pure copper and brass after annealing in argon gas. It was demonstrated that low EWF values, small EWF fluctuations, and narrow fluctuation ranges in interfacial regions corresponded to good bonding. Furthermore, there was a strong correlation between the EWF and the interfacial strength determined by the microindentation method using a universal microtribometer. The Kelvin probing technique could be a powerful tool for studying the local property and structure of interfaces.

Li, W.; Li, D.Y. [Department of Mechanical Engineering, Changchun University, People's Republic of China (130022) and Department of Mechanical Engineering, University of Alberta, Edmonton, T6G 2G8 (Canada); Department of Chemical and Materials Engineering, University of Alberta, Edmonton, T6G 2G6 (Canada)

2005-01-01T23:59:59.000Z

68

Wall scanning probe for high-field side plasma measurements on Alcator C-Mod  

Science Conference Proceedings (OSTI)

A new, high-field side scanning probe has been added to Alcator C-Mod's complement of edge diagnostics. The wall scanning probe is designed to provide all the benefits of a linear plunge, multielectrode scanning probe while working from the confined space of the inner tokamak wall. The drive mechanism is an embedded coil which produces a torque with the ambient toroidal magnetic field when energized, thus allowing the probe to plunge to different preprogramed depths at different times during a plasma discharge. The probe tip is designed for easy replacement and is presently configured to operate as a modified, high heat-flux ''Gundestrup-type'' probe with four tungsten electrodes. The probe has demonstrated the ability to obtain cross-field profiles for electron temperature, density, floating potential, and plasma flow information (parallel and perpendicular to B) up to a depth of a few millimiters inside the last-closed flux surface in standard C-Mod discharges. The tungsten-tipped probe has proved very robust and shows little or no damage though it routinely handles surface heat fluxes on the order of 100 MW/m{sup 2} at peak insertion.

Smick, Noah; LaBombard, Brian [Plasma Science and Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

2009-02-15T23:59:59.000Z

69

Application of scanning mid-IR-laser microscopy for characterization of semiconductor materials for photovoltaics  

E-Print Network (OSTI)

The scanning mid-IR-laser microscopy was previously demonstrated as an effective tool for characterization of different semiconductor crystals. Now the technique has been successfully applied for the investigation of CZ SixGe1-x -- a promising material for photovoltaics - and multicrystalline silicon for solar cells. In addition, this technique was shown to be appropriate for imaging of polishing-induced defects as well as such huge defects as "pin holes". Besides, previously unexplained "anomalous" (cubic power) dependence of signal of the scanning mid-IR-laser microscope in the optical-beam-induced light scattering mode on the photoexcitation power obtained for mechanically polished samples has now been attributed to the excess carrier scattering on charged linear defects, likely dislocation lines. The conclusion is made in the article that the scanning mid-IR-laser microscopy may serve as very effective tool for defect investigations in materials for modern photovoltaics.

Kalinushkin, V P; Yuryev, V A; 10.1016/S0927-0248(00)00076-3

2011-01-01T23:59:59.000Z

70

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene  

E-Print Network (OSTI)

We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the energy transfer distance dependence of 14 the nitrogen-vacancy center to graphene was measured to show the predicted d-4 15 dependence. Our studies pave the way towards a diamond defect center based versatile 16 single emitter scanning microscope.

J. Tisler; T. Oeckinghaus; R. Stöhr; R. Kolesov; F. Reinhard; J. Wrachtrup

2013-01-02T23:59:59.000Z

71

Scanning transmission x-ray microscopy: A new ``looking glass`` into coal chemical structure  

SciTech Connect

This paper reports the use of scanning transmission x-ray microscopy to spatially map the chemistry of aromatic and aliphatic carbon functionalities in coal to a resolution of less than 0.1 {mu}m. Localized x-ray absorption spectroscopy recorded at the carbon K absorption edge was also used to facilitate analysis of variations in fundamental chemistry at maceral interfaces and within maceral boundaries.

Botto, R.E.; Cody, G.D.

1994-02-01T23:59:59.000Z

72

Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips  

Science Conference Proceedings (OSTI)

A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM.

Eisenstein, Alon; Goh, M. Cynthia [Department of Chemistry and Institute for Optical Sciences, University of Toronto, 80 St. George Street, Toronto M5S 3H6 (Canada)

2012-03-15T23:59:59.000Z

73

Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy  

E-Print Network (OSTI)

-contacted pristine graphene [6]. The line scan of the voltage drop along the FGS shows a pronounced non uniform was used to make contacts to FGS, which requires high accuracy in locating any graphene sheets of typically;contacts with the graphene sheet underneath. As can be seen in Figure 1 (b), the Kelvin voltage changes

Aksay, Ilhan A.

74

Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscopy Home Staff Only Microscopy Group Staff InstrumentationCapabilities The Advanced Microscopy Laboratory (AML) Microscopy User Centers: MAUC SHaRE Research Highlights...

75

Robust atomic resolution imaging of light elements using scanning transmission electron microscopy  

SciTech Connect

We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics.

Findlay, S. D. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Shibata, N. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); PRESTO, Japan Science and Technology Agency, Saitama 332-0012 (Japan); Sawada, H.; Okunishi, E.; Kondo, Y. [JEOL Ltd., Tokyo 196-8558 (Japan); Yamamoto, T. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587 (Japan); Ikuhara, Y. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587 (Japan); WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)

2009-11-09T23:59:59.000Z

76

Structure and Reactions of Carbon and Hydrogen on Ru(0001): A Scanning Tunneling Microscopy Study  

DOE Green Energy (OSTI)

The interaction between carbon and hydrogen atoms on a Ru(0001) surface was studied using scanning tunneling microscopy (STM), Density Functional Theory (DFT) and STM image calculations. Formation of CH species by reaction between adsorbed H and C was observed to occur readily at 100 K. When the coverage of H increased new complexes of the form CH+nH (n = 1, 2 and 3) were observed. These complexes, never observed before, might be precursors for further hydrogenation reactions. DFT analysis reveals that a considerable energy barrier exists for the CH+H {yields} CH{sub 2} reaction.

Shimizu, Tomoko K.; Mugarza, Aitor; Cerda, Jorge; Salmeron, Miquel

2008-09-09T23:59:59.000Z

77

Plasmonic Field Enhancement of Individual Nanoparticles by Correlated Scanning and Photoemission Electron Microscopy  

SciTech Connect

We present results of a combined two-photon photoemission and scanning electron microscopy investigation to determine the electromagnetic enhancement factors of silver-coated spherical nanoparticles deposited on an atomically flat mica substrate. Femtosecond laser excitation, of the nanoparticles, produces intense photoemission, attributed to near-resonant excitation of localized surface plasmons. Enhancement factors are determined by comparing the respective two-photon photoemission yield measured for equal areas between single nanoparticles to that of the surrounding flat surface. For s-polarized, 400 nm (~ 3.1 eV) femtosecond radiation a distribution of enhancement factors are found with a large percentage (77%) of the nanoparticles falling within a median range. A correlated scanning electron microscopy analysis demonstrated that the nanoparticles typifying the median of the distribution were characterized by ideal spherical shapes and defect-free morphologies. The single largest enhancement factors were in contrast produced by a very small percentage (8%) of the total, for which evidence of silver defect anomalies were found that contributed to the overall structure of the nanoparticle. Comparisons are made between the experimentally measured enhancement factors and previously reported theoretical predictions of the localized surface plasmon near-field intensities for isolated nanometer-sized silver spheres.

Peppernick, Samuel J.; Joly, Alan G.; Beck, Kenneth M.; Hess, Wayne P.

2011-01-21T23:59:59.000Z

78

Iran Thomas Auditorium, 8600 Transport Measurements by Scanning...  

NLE Websites -- All DOE Office Websites (Extended Search)

8600 Transport Measurements by Scanning Probe Microscopy: Possibilities for Graphene Randall M. Feenstra Department of Physics Carnegie Mellon University CNMS D D I I S S...

79

EMSL: Capabilities: Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscopy Microscopy Additional Information Meet the Microscopy Experts Related EMSL User Projects Microscopy Tools are Applied to all Science Themes Watch the Microscopy capability video on EMSL's YouTube channel and read the transcript. Microscopy brochure Quiet Wing brochure EMSL hosts a variety of sophisticated microscopy instruments, including electron microscopes, optical microscopes, scanning probe microscopes, and computer-controlled microscopes for automated particle analysis. These tools are used to image a range of sample types with nanoscale-and even atomic-resolution with applications to surface, environmental, biogeochemical, atmospheric, and biological science. Each state-of-the-art instrument and customized capability is equipped with features for specific

80

Scanning tunneling microscopy reveals LiMnAs is a room temperature anti-ferromagnetic semiconductor  

SciTech Connect

We performed scanning tunneling microscopy and spectroscopy on a LiMnAs(001) thin film epitaxially grown on an InAs(001) substrate by molecular beam epitaxy. While the in situ cleavage exposed only the InAs(110) non-polar planes, the cleavage continued into the LiMnAs thin layer across several facets. We combined both topography and current mappings to confirm that the facets correspond to LiMnAs. By spectroscopy we show that LiMnAs has a band gap. The band gap evidenced in this study, combined with the known Neel temperature well above room temperature, confirms that LiMnAs is a promising candidate for exploring the concepts of high temperature semiconductor spintronics based on antiferromagnets.

Wijnheijmer, A. P.; Koenraad, P. M. [COBRA Inter-University Research Institute, Department of Applied Physics, Eindhoven University of Technology, P. O. Box 513, NL-5600 MB Eindhoven (Netherlands); Marti, X. [Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 3, 121 16 Prague 2 (Czech Republic); Institute of Physics ASCR, v.v.i., Cukrovarnicka 10, 162 53 Prague 6 (Czech Republic); Holy, V. [Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 3, 121 16 Prague 2 (Czech Republic); Cukr, M.; Novak, V. [Institute of Physics ASCR, v.v.i., Cukrovarnicka 10, 162 53 Prague 6 (Czech Republic); Jungwirth, T. [Institute of Physics ASCR, v.v.i., Cukrovarnicka 10, 162 53 Prague 6 (Czech Republic); School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD (United Kingdom)

2012-03-12T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


81

Hydrogen adsorption on Ru(001) studied by Scanning TunnelingMicroscopy  

SciTech Connect

The adsorption of hydrogen on Ru(001) was studied by scanning tunneling microscopy at temperatures around 50 K. Hydrogen was found to adsorb dissociatively forming different ordered structures as a function of coverage. In order of increasing coverage {theta} in monolayers (ML) these were ({radical}3 x {radical}3)r30{sup o} at {theta} = 0.3 ML; (2 x 1) at {theta} = 0.50 ML, (2 x 2)-3H at {theta} = 0.75, and (1 x 1) at {theta} = 1.00. Some of these structures were observed to coexist at intermediate coverage values. Close to saturation of 1 ML, H-vacancies (unoccupied three fold fcc hollow Ru sites) were observed either as single entities or forming transient aggregations. These vacancies diffuse and aggregate to form active sites for the dissociative adsorption of hydrogen.

Tatarkhanov, Mous; Rose, Franck; Fomin, Evgeny; Ogletree, D.Frank; Salmeron, Miquel

2008-01-18T23:59:59.000Z

82

Ultrasonic probe deployment device for increased wave transmission and rapid area scan inspections  

DOE Patents (OSTI)

An ultrasonic probe deployment device in which an ultrasound-transmitting liquid forms the portion of the ultrasonic wave path in contact with the surface being inspected (i.e., the inspection surface). A seal constrains flow of the liquid, for example preventing the liquid from surging out and flooding the inspection surface. The seal is not rigid and conforms to variations in the shape and unevenness of the inspection surface, thus forming a seal (although possibly a leaky seal) around the liquid. The probe preferably is held in place to produce optimum ultrasonic focus on the area of interest. Use of encoders can facilitate the production of C-scan area maps of the material being inspected.

DiMambro, Joseph; Roach, Dennis P; Rackow, Kirk A; Nelson, Ciji L; Dasch, Cameron J; Moore, David G

2013-02-12T23:59:59.000Z

83

Ultrasonic probe deployment device for increased wave transmission and rapid area scan inspections  

DOE Patents (OSTI)

An ultrasonic probe deployment device in which an ultrasound-transmitting liquid forms the portion of the ultrasonic wave path in contact with the surface being inspected (i.e., the inspection surface). A seal constrains flow of the liquid, for example preventing the liquid from surging out and flooding the inspection surface. The seal is not rigid and conforms to variations in the shape and unevenness of the inspection surface, thus forming a seal (although possibly a leaky seal) around the liquid. The probe preferably is held in place to produce optimum ultrasonic focus on the area of interest. Use of encoders can facilitate the production of C-scan area maps of the material being inspected.

DiMambro, Joseph (Placitas, NM); Roach, Dennis P. (Albuquerque, NM); Rackow, Kirk A. (Albuquerque, NM); Nelson, Ciji L. (Albuquerque, NM); Dasch, Cameron J. (Boomfield Hills, MI); Moore, David G. (Albuquerque, NM)

2012-01-03T23:59:59.000Z

84

Scanning tunneling microscopy observation of Pb-induced superstructures on Si(557)  

Science Conference Proceedings (OSTI)

Pb-induced superstructures on Si(557) are investigated by low-energy-electron diffraction (LEED) and scanning tunneling microscopy (STM). Using an indirect heating method, we have succeeded in obtaining almost perfect single-domain LEED patterns of one-dimensional wire (chain) structures, so called {alpha}x2 and {beta}x2 phases. Careful LEED analysis and STM investigation reveal that these phases are formed on the (223) and (112) facets, respectively. The {alpha}x2 phase has regular bundles of triple wires at low annealing temperature but wider bundles through step bunching after a higher temperature annealing. Along the wires of the {alpha}x2 phase, which was recently reported to exhibit a transition between one-dimensional (1D) metallic and 2D semiconducting conductance, a clear commensurate x2 modulation is observed at 78-120 K in contrast to the incommensurate and disordered structure reported previously. A tentative atomic structure model of the {alpha}x2 phase is proposed based on the dense Pb overlayers on (111) and (223) facets. The details of the STM images of the {beta}x2 phase are discussed.

Morikawa, Harumo; Kim, Keun Su; Jung, Duk Yong; Yeom, Han Woong [Institute of Physics and Applied Physics and Center for Atomic Wires and Layers, Yonsei University, 134 Shinchon, Seoul 120-749 (Korea, Republic of)

2007-10-15T23:59:59.000Z

85

Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy  

Science Conference Proceedings (OSTI)

Observation of growth, synthesis, dynamics and electrochemical reactions in the liquid state is an important yet largely unstudied aspect of nanotechnology. The only techniques that can potentially provide the insights necessary to advance our understanding of these mechanisms is simultaneous atomic-scale imaging and quantitative chemical analysis (through spectroscopy) under environmental conditions in the transmission electron microscope (TEM). In this study we describe the experimental and technical conditions necessary to obtain electron energy loss (EEL) spectra from a nanoparticle in colloidal suspension using aberration corrected scanning transmission electron microscopy (STEM) combined with the environmental liquid stage. At a fluid path length below 400 nm, atomic resolution images can be obtained and simultaneous compositional analysis can be achieved. We show that EEL spectroscopy can be used to quantify the total fluid path length around the nanoparticle, and demonstrate characteristic core-loss signals from the suspended nanoparticles can be resolved and analyzed to provide information on the local interfacial chemistry with the surrounding environment. The combined approach using aberration corrected STEM and EEL spectra with the in situ fluid stage demonstrates a plenary platform for detailed investigations of solution based catalysis and biological research.

Jungjohann, K. L.; Evans, James E.; Aguiar, Jeff; Arslan, Ilke; Browning, Nigel D.

2012-06-04T23:59:59.000Z

86

FORCE SENSING IN SCANNING TUNNELING MICROSCOPY U. DURIG, J.K. GIMZEWSKI, D.W. POHL and R. SCHLITTLER  

E-Print Network (OSTI)

FORCE SENSING IN SCANNING TUNNELING MICROSCOPY U. DURIG, J.K. GIMZEWSKI, D.W. POHL and R, (1986) 930. [3] U. Durig, J.K. Gimzewski, and D.W. Pohl, Phys. Rev. Lett., in press. [4] J. Soler, A

Gimzewski, James

87

Direct measurement of interfacial structure in epitaxial Gd2O3 on GaAs (001) using scanning tunneling microscopy  

Science Conference Proceedings (OSTI)

The epitaxial growth of Gd"2O"3 on GaAs (001) has given a low interfacial density of states, resulting in the demonstration of the first inversion-channel GaAs metal-oxide-semiconductor field-effect transistor. Motivated by the significance of this discovery, ... Keywords: Electronic information, GaAs, Gd2O3, Interfacial stacking, Scanning tunneling microscopy

Y. P. Chiu; M. C. Shih; B. C. Huang; J. Y. Shen; M. L. Huang; W. C. Lee; P. Chang; T. H. Chiang; M. Hong; J. Kwo

2011-07-01T23:59:59.000Z

88

SCANNING ELECTRON MICROSCOPY AND X-RAY DIFFRACTION ANALYSIS OF TANK 18 SAMPLES  

Science Conference Proceedings (OSTI)

The F-Area Tank Farm (FTF) Performance Assessment (PA) utilizes waste speciation in the waste release model used in the FTF fate and transport modeling. The waste release modeling associated with the residual plutonium in Tank 18 has been identified as a primary contributor to the Tank 18 dose uncertainty. In order to reduce the uncertainty related to plutonium in Tank 18, a better understanding of the plutonium speciation in the Tank 18 waste (including the oxidation state and stoichiometry) is desired. Savannah River National Laboratory (SRNL) utilized Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to analyze Tank 18 samples to provide information on the speciation of plutonium in the waste material. XRD analysis of the Tank 18 samples did not identify any plutonium mineral phases in the samples. These indicates the crystalline mineral phases of plutonium are below the detection limits of the XRD method or that the plutonium phase(s) lack long range order and are present as amorphous or microcrystalline solids. SEM analysis of the Tank 18 samples did locate particles containing plutonium. The plutonium was found as small particles, usually <1 {micro}m but ranging up to several micrometers in diameter, associated with particles of an iron matrix and at low concentration in other elemental matrices. This suggests the plutonium has an affinity for the iron matrix. Qualitatively, the particles of plutonium found in the SEM analysis do not appear to account for all of the plutonium in the sample based on concentrations determined from the chemical analysis of the Tank 18 samples. This suggests that plutonium is also distributed throughout the solids in low concentrations.

Hay, M.; O'Rourke, P.; Ajo, H.

2012-03-08T23:59:59.000Z

89

Scanning tunneling microscopy studies on the structure and stability of model catalysts  

E-Print Network (OSTI)

An atomic level understanding of the structure and stability of model catalysts is essential for surface science studies in heterogeneous catalysis. Scanning tunneling microscopy (STM) can operate both in UHV and under realistic pressure conditions with a wide temperature span while providing atomic resolution images. Taking advantage of the ability of STM, our research focuses on 1) investigating the structure and stability of supported Au catalysts, especially under CO oxidation conditions, and 2) synthesizing and characterizing a series of alloy model catalysts for future model catalytic studies. In our study, Au clusters supported on TiO2(110) have been used to model supported Au catalysts. Our STM studies in UHV reveal surface structures of TiO2(110) and show undercoordinated Ti cations play a critical role in the nucleation and stabilization of Au clusters on TiO2(110). Exposing the TiO2(110) surface to water vapor causes the formation of surface hydroxyl groups and subsequently alters the growth kinetics of Au clusters on TiO2(110). STM studies on Au/TiO2(110) during CO oxidation demonstrate the real surface of a working catalyst. Au clusters supported on TiO2(110) sinter rapidly during CO oxidation, but are mostly stable in the single component reactant gas, either CO or O2. The sintering kinetics of supported Au clusters has been measured during CO oxidation and gives an activation energy, which supports the mechanism of CO oxidation induced sintering. CO oxidation was also found to accelerate the surface diffusion of Rh(110). Our results show a direct correlation between the reaction rate of CO oxidation and the diffusion rate of surface metal atoms. Synthesis of alloy model catalysts have also been attempted in our study with their structures successfully characterized. Planar Au-Pd alloy films has been prepared on a Rh(100) surface with surface Au and Pd atoms distinguished by STM. The growth of Au-Ag alloy clusters have been studied by in-situ STM on a cluster-to-cluster basis. Moreover, the atomic structure of a solution-prepared Ru3Sn3 cluster has been resolved on an ultra-thin silica film surface. The atomic structure and adsorption sites of the ultrathin silica film have also been well characterized in our study.

Yang, Fan

2007-12-01T23:59:59.000Z

90

A new high-resolution two-dimensional micropositioning device for scanning probe microscopy applications  

E-Print Network (OSTI)

in the depoling field in the BT layer as well as a drop in the internal field in the ST layer that induces

91

Adsorbate structures and catalytic reactions studied in the torrpressure range by scanning tunneling microscopy  

DOE Green Energy (OSTI)

High-pressure, high-temperature scanning tunneling microscopy (HPHTSTM) was used to study adsorbate structures and reactions on single crystal model catalytic systems. Studies of the automobile catalytic converter reaction [CO + NO {yields} 1/2 N{sub 2} + CO{sub 2}] on Rh(111) and ethylene hydrogenation [C{sub 2}H{sub 4} + H{sub 2} {yields} C{sub 2}H{sub 6}] on Rh(111) and Pt(111) elucidated information on adsorbate structures in equilibrium with high-pressure gas and the relationship of atomic and molecular mobility to chemistry. STM studies of NO on Rh(111) showed that adsorbed NO forms two high-pressure structures, with the phase transformation from the (2 x 2) structure to the (3 x 3) structure occurring at 0.03 Torr. The (3 x 3) structure only exists when the surface is in equilibrium with the gas phase. The heat of adsorption of this new structure was determined by measuring the pressures and temperatures at which both (2 x 2) and (3 x 3) structures coexisted. The energy barrier between the two structures was calculated by observing the time necessary for the phase transformation to take place. High-pressure STM studies of the coadsorption of CO and NO on Rh(111) showed that CO and NO form a mixed (2 x 2) structure at low NO partial pressures. By comparing surface and gas compositions, the adsorption energy difference between topsite CO and NO was calculated. Occasionally there is exchange between top-site CO and NO, for which we have described a mechanism for. At high NO partial pressures, NO segregates into islands, where the phase transformation to the (3 x 3) structure occurs. The reaction of CO and NO on Rh(111) was monitored by mass spectrometry (MS) and HPHTSTM. From MS studies the apparent activation energy of the catalytic converter reaction was calculated and compared to theory. STM showed that under high-temperature reaction conditions, surface metal atoms become mobile. Ethylene hydrogenation and its poisoning by CO was also studied by STM on Rh(111) and Pt(111). Poisoning was found to coincide with decreased adsorbate mobility. Under ethylene hydrogenation conditions, no order is detected by STM at 300 K, as hydrogen and ethylidyne, the surface species formed by gas-phase ethylene, are too mobile. When CO is introduced, the reaction stops, and ordered structures appear on the surface. For Rh(111), the structure is predominantly a mixed c(4 x 2), though there are some areas of (2 x 2). For Pt(111), the structure is hexagonal and resembles the Moire pattern seen when Pt(111) is exposed to pure CO. From these studies it is concluded that CO poisons by stopping adsorbate mobility. This lack of adsorbate mobility prevents the adsorption of ethylene from the gas phase by hindering the creation of adsorption sites.

Hwang, Kevin Shao-Lin

2003-05-23T23:59:59.000Z

92

Laser-assisted scanning probe alloying nanolithography (LASPAN) and its application in gold-silicon system  

E-Print Network (OSTI)

Nanoscale science and technology demand novel approaches and new knowledge to further advance. Nanoscale fabrication has been widely employed in both modern science and engineering. Micro/nano lithography is the most common technique to deposit nanostructures. Fundamental research is also being conducted to investigate structural, physical and chemical properties of the nanostructures. This research contributes fundamental understanding in surface science through development of a new methodology. Doing so, experimental approaches combined with energy analysis were carried out. A delicate hardware system was designed and constructed to realize the nanometer scale lithography. We developed a complete process, namely laser-assisted scanning probe alloying nanolithography (LASPAN), to fabricate well-defined nanostructures in gold-silicon (Au-Si) system. As a result, four aspects of nanostructures were made through different experimental trials. A non-equilibrium phase (AuSi3) was discovered, along with a non-equilibrium phase diagram. Energy dissipation and mechanism of nanocrystalization in the process have been extensively discussed. The mechanical energy input and laser radiation induced thermal energy input were estimated. An energy model was derived to represent the whole process of LASPAN.

Peng, Luohan

2008-08-01T23:59:59.000Z

93

Measurement of probe displacement to the thermal resolution limit in photonic force microscopy using a miniature quadrant photodetector  

Science Conference Proceedings (OSTI)

A photonic force microscope comprises of an optically trapped micro-probe and a position detection system to track the motion of the probe. Signal collection for motion detection is often carried out using the backscattered light off the probe-however, this mode has problems of low S/N due to the small backscattering cross sections of the micro-probes typically used. The position sensors often used in these cases are quadrant photodetectors. To ensure maximum sensitivity of such detectors, it would help if the detector size matched with the detection beam radius after the condenser lens (which for backscattered detection would be the trapping objective itself). To suit this condition, we have used a miniature displacement sensor whose dimensions makes it ideal to work with 1:1 images of micrometer-sized trapped probes in the backscattering detection mode. The detector is based on the quadrant photo-integrated chip in the optical pick-up head of a compact disc player. Using this detector, we measured absolute displacements of an optically trapped 1.1 {mu}m probe with a resolution of {approx}10 nm for a bandwidth of 10 Hz at 95% significance without any sample or laser stabilization. We characterized our optical trap for different sized probes by measuring the power spectrum for each probe to 1% accuracy, and found that for 1.1 {mu}m diameter probes, the noise in our position measurement matched the thermal resolution limit for averaging times up to 10 ms. We also achieved a linear response range of around 385 nm with cross talk between axes {approx_equal}4% for 1.1 {mu}m diameter probes. The detector has extremely high bandwidth (few MHz) and low optical power threshold-other factors that can lead to its widespread use in photonic force microscopy.

Pal, Sambit Bikas; Haldar, Arijit; Roy, Basudev; Banerjee, Ayan [Department of Physical Sciences, IISER-Kolkata, West Bengal 741252 (India)

2012-02-15T23:59:59.000Z

94

Synthesis and characterization of carbon nanotubes using scanning probe based nano-lithographic techniques  

E-Print Network (OSTI)

A novel process which does not require the traditional Chemical Vapor Deposition (CVD) synthesis techniques and which works at temperatures lower than the conventional techniques was developed for synthesis of carbon nanotubes (CNT). The substrates used for this study involved MEMS (Micro Electrical Mechanical Systems) elements and passive elements. These were coated with Fullerene using Physical Vapor Deposition or through a solution in an organic solvent. Catalyst precursors were deposited on these Fullerene coated substrates using “wet processes”. These substrates were then heated using either the integrated microheaters or external heaters in an inert atmosphere to obtain CNT. Thus, in this process we tried to obviate the Chemical Vapor Deposition (CVD) process for synthesis of CNT (SWCNT and MWCNT). The synthesized CNT will be characterized using Scanning Electron Microscopy and Raman spectroscopy techniques. Also, conductivity measurements were carried out for the synthesized tubes using Dry (contact based) and Wet (electro-chemical) methods. This work also proves the concept for the feasibility for a portable hand held instrument for synthesis of CNT with tunable “on demand” chirality.

Gargate, Rohit Vasant

2008-12-01T23:59:59.000Z

95

Proximal Probes | Center for Functional Nanomaterials  

NLE Websites -- All DOE Office Websites (Extended Search)

Proximal Probes Facility Proximal Probes Facility proximal probes The Proximal Probes Facility consists of laboratories for microscopy, spectroscopy, and probing of nanostructured materials and their functional properties. At the core of the facility is a suite of instruments for in-situ microscopy of surfaces and nanostructures under extreme conditions, e.g., in reactive gases, and at high or low temperatures. Unique instruments enable in-situ and in-operando studies of surface chemistry and catalysis at pressures from ultrahigh vacuum (UHV) to 5 bar via complementary scanning tunneling microscopy imaging and photoelectron spectroscopy, coupled with real-time gas analysis. Several UHV systems are available for scanning tunneling and atomic force microscopy, as well as low-energy electron microscopy and synchrotron photoelectron microscopy. A

96

A new bend magnet beam line for scanning transmission x-ray microscopy at the Advanced Light Source  

Science Conference Proceedings (OSTI)

The high brightness of the bend magnets at the Advanced Light Source has been exploited to illuminate a Scanning Transmission X-ray Microscope (STXM). This is the first diffraction-limited scanning x-ray microscope to operate with useful count rate on a synchrotron bend magnet source. A simple, dedicated beam line has been built covering the range of photon energy from 250 eV to 600 eV. Ease of use and operational availability are radically improved compared to previous installations using undulator beams. This facility provides radiation for C 1s, N 1s and O 1s near edge x-ray absorption spectro-microscopy with a spectral resolution up to about 1:5000 and with STXM count rates in excess of 1 MHz.

Warwick, Tony; Ade, Harald; Kilcoyne, A.L. David; Kritscher, Michael; Tylisczcak, Tolek; Fakra, Sirine; Hitchcock, Adam P.; Hitchcock, Peter; Padmore, Howard A.

2001-12-12T23:59:59.000Z

97

Scanning-tunneling-microscopy studies of disilane adsorption and pyrolytic growth on Si(100)-(2x1)  

SciTech Connect

Scanning tunneling microscopy has been employed to study the adsorption of disilane (Si{sub 2}H{sub 6}) and pyrolytic growth on Si(100)-(2{times}1) at various temperatures. Room-temperature exposures result in a random distribution of dissociation fragments on the surface. Formation of anisotropic monohydride islands and denuded zones as well as island coarsening is observed at higher temperatures. The results are strikingly similar to those reported for growth by molecular-beam epitaxy using pure Si, even though different surface reactions are involved in these two growth processes.

Lin, D.; Hirschorn, E.S.; Chiang, T. (Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)); Tsu, R.; Lubben, D.; Greene, J.E. (Department of Materials Science, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States) Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States))

1992-02-15T23:59:59.000Z

98

Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy  

DOE Patents (OSTI)

A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

Kazmerski, Lawrence L. (Lakewood, CO)

1990-01-01T23:59:59.000Z

99

Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters  

Science Conference Proceedings (OSTI)

Atomic-resolution imaging in the scanning transmission electron microscope (STEM) constitutes a powerful tool for nanostructure characterization. Here, we demonstrate the quantitative interpretation of atomic-resolution high-angle annular dark-field (ADF) STEM images using an approach that does not rely on adjustable parameters. We measure independently the instrumental parameters that affect sub-0.1 nm-resolution ADF images, quantify their individual and collective contributions to the image intensity, and show that knowledge of these parameters enables a quantitative interpretation of the absolute intensity and contrast across all accessible spatial frequencies. The analysis also provides a method for the in-situ measurement of the STEM's effective source distribution.

Dwyer, C. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Department of Materials Engineering, Monash University, Victoria 3800 (Australia); ARC Centre of Excellence for Design in Light Metals, Monash University, Victoria 3800 (Australia); Maunders, C. [Department of Materials Engineering, Monash University, Victoria 3800 (Australia); Zheng, C. L. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Weyland, M.; Etheridge, J. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Department of Materials Engineering, Monash University, Victoria 3800 (Australia); Tiemeijer, P. C. [FEI Electron Optics, P.O. Box 80066, 5600 KA Eindhoven (Netherlands)

2012-05-07T23:59:59.000Z

100

Low Temperature Scanning Force Microscopy of the Si(111)-( 7x7) Surface  

Science Conference Proceedings (OSTI)

A low temperature scanning force microscope (SFM) operating in a dynamic mode in ultrahigh vacuum was used to study the Si(111)-(7x7) surface at 7.2 K. Not only the twelve adatoms but also the six rest atoms of the unit cell are clearly resolved for the first time with SFM. In addition, the first measurements of the short range chemical bonding forces above specific atomic sites are presented. The data are in good agreement with first principles computations and indicate that the nearest atoms in the tip and sample relax significantly when the tip is within a few Angstrom of the surface. (c) 2000 The American Physical Society.

Lantz, M. A. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Hug, H. J. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Schendel, P. J. A. van [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Hoffmann, R. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Martin, S. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Baratoff, A. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Abdurixit, A. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Guentherodt, H.-J. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Gerber, Ch. [IBM Research Division, Zuerich Research Laboratory, Saeumerstrasse 4, CH-8803 Rueschlikon, (Switzerland)

2000-03-20T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


101

Scanning tunneling microscopy studies of the surfaces of a-Si:H and a-SiGe:H films  

SciTech Connect

The report contains a detailed description of the experimental complexities encountered in developing scanning tunneling microscope (STM) probing of atomic structure on the surface of freshly-grown hydrogenated-amorphous semiconductors. It also contains a speculative microscopic film-growth model that explains differences between the disorder in CVD grown a-Ge:H versus a-Si:H films. This model is derived from prior results obtained in the chemical analysis of GeH{sub 4} plasmas, combined with surface reaction and thermodynamic considerations. The neutral radical fragments of silane, disilane and germane dissociation in discharges, which dominate the vapor and film-growth reactions, have been deduced from detailed analysis of prior data and are reported. 4 refs., 7 figs.

Gallagher, A.; Ostrom, R.; Tannenbaum, D. (National Inst. of Standards and Technology, Boulder, CO (USA))

1991-06-01T23:59:59.000Z

102

High speed optical coherence microscopy with autofocus adjustment and a miniaturized endoscopic imaging probe  

E-Print Network (OSTI)

Optical coherence microscopy (OCM) is a promising technique for high resolution cellular imaging in human tissues. An OCM system for high-speed en face cellular resolution imaging was developed at 1060 nm wavelength at ...

Aguirre, Aaron Dominic

103

GaSb/GaAs quantum dot formation and demolition studied with cross-sectional scanning tunneling microscopy  

Science Conference Proceedings (OSTI)

We present a cross-sectional scanning tunneling microscopy study of GaSb/GaAs quantum dots grown by molecular beam epitaxy. Various nanostructures are observed as a function of the growth parameters. During growth, relaxation of the high local strain fields of the nanostructures plays an important role in their formation. Pyramidal dots with a high Sb content are often accompanied by threading dislocations above them. GaSb ring formation is favored by the use of a thin GaAs first cap layer and a high growth temperature of the second cap layer. At these capping conditions, strain-driven Sb diffusion combined with As/Sb exchange and Sb segregation remove the center of a nanostructure, creating a ring. Clusters of GaSb without a well defined morphology also appear regularly, often with a highly inhomogeneous structure which is sometimes divided up in fragments.

Smakman, E. P.; Garleff, J. K.; Rambabu, P.; Koenraad, P. M. [Department of Applied Physics, Eindhoven University of Technology, Eindhoven 5612 AZ (Netherlands); Young, R. J.; Hayne, M. [Department of Physics, Lancaster University, Lancaster LA1 4YB (United Kingdom)

2012-04-02T23:59:59.000Z

104

Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ioni Beam-scanning Electron Microscopy  

Science Conference Proceedings (OSTI)

X-ray nanotomography and focused ion beam scanning electron microscopy (FIB-SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIB-SEM enable elemental mapping within the microstructure. Using these methods, non-destructive 3D x-ray imaging and FIB-SEM serial sectioning have been applied to compare three-dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

G Nelson; W Harris; J Lombardo; J Izzo Jr.; W Chiu; P Tanasini; M Cantoni; J Van herle; C Comninellis; et al.

2011-12-31T23:59:59.000Z

105

Scanning tunneling microscopy of charge density wave structure in 1T- TaS sub 2  

SciTech Connect

I have used a scanning tunneling microscope (STM) to image simultaneously the atomic lattice and the charge density wave (CDW) superstructure in tantalum disulfide (1T-TaS{sub 2}) over the temperature range of 370-77K. In the lowest temperature (commensurate) phase, present below 180K, the CDW is at an angle of 13.9{degrees} relative to the lattice and is uniformly commensurate. In the incommensurate phase, present above 353K, the CDW is aligned with the lattice. 1T-TaS{sub 2} exhibits two other phases; the triclinic (T) phase which is present between 223K and 283K upon warming the sample, and the nearly-commensurate (NC) phase which is present between 353K and 180K upon cooling the sample and between 283K and 353K upon warming the sample. In both of these phases, discommensurate models where the CDW is arranged in small commensurate domains have been proposed. In the NC phase the CDW is rotated between 10{degrees} and 12.5{degrees} relative to the atomic lattice. Such a rotated CDW would create an interference pattern with the underlying atomic lattice regardless of the existence of a true domain superstructure. Previous work on 1T-TaS{sub 2} has not adequately accounted for the possibility of this moire pattern. However, around each fundamental CDW peak in the Fourier transform of the real space STM images, several satellite spots are visible, which conclusively prove the existence of domains in the NC phase.

Thomson, R.E.

1991-11-01T23:59:59.000Z

106

Scanning tunneling microscopy of charge density wave structure in 1T- TaS{sub 2}  

SciTech Connect

I have used a scanning tunneling microscope (STM) to image simultaneously the atomic lattice and the charge density wave (CDW) superstructure in tantalum disulfide (1T-TaS{sub 2}) over the temperature range of 370-77K. In the lowest temperature (commensurate) phase, present below 180K, the CDW is at an angle of 13.9{degrees} relative to the lattice and is uniformly commensurate. In the incommensurate phase, present above 353K, the CDW is aligned with the lattice. 1T-TaS{sub 2} exhibits two other phases; the triclinic (T) phase which is present between 223K and 283K upon warming the sample, and the nearly-commensurate (NC) phase which is present between 353K and 180K upon cooling the sample and between 283K and 353K upon warming the sample. In both of these phases, discommensurate models where the CDW is arranged in small commensurate domains have been proposed. In the NC phase the CDW is rotated between 10{degrees} and 12.5{degrees} relative to the atomic lattice. Such a rotated CDW would create an interference pattern with the underlying atomic lattice regardless of the existence of a true domain superstructure. Previous work on 1T-TaS{sub 2} has not adequately accounted for the possibility of this moire pattern. However, around each fundamental CDW peak in the Fourier transform of the real space STM images, several satellite spots are visible, which conclusively prove the existence of domains in the NC phase.

Thomson, R.E.

1991-11-01T23:59:59.000Z

107

Electrical transport and mechanical properties of alkylsilane self-assembled monolayers on silicon surfaces probed by atomic force microscopy  

SciTech Connect

The correlation between molecular conductivity and mechanical properties (molecular deformation and frictional responses) of hexadecylsilane self-assembled monolayers was studied with conductive probe atomic force microscopy/friction force microscopy in ultrahigh vacuum. Current and friction were measured as a function of applied pressure, simultaneously, while imaging the topography of self-assembled monolayer molecule islands and silicon surfaces covered with a thin oxide layer. Friction images reveal lower friction over the molecules forming islands than over the bare silicon surface, indicating the lubricating functionality of alkylsilane molecules. By measuring the tunneling current change due to changing of the height of the molecular islands by tilting the molecules under pressure from the tip, we obtained an effective conductance decay constant ({beta}) of 0.52/{angstrom}.

Park, Jeong Young; Qi, Yabing; Ashby, Paul D.; Hendriksen, Bas L.M.; Salmeron, Miquel

2009-02-06T23:59:59.000Z

108

Argonne CNM: Proximal Probes Capabilities  

NLE Websites -- All DOE Office Websites (Extended Search)

Proximal Probes Proximal Probes Capabilities Omicron VT-AFM XA microscope scanning tunneling microscope VIew high-resolution image. Variable-temperature, ultra-high-vacuum, atomic force microscope/scanning tunneling microscope: Omicron VT-AFM XA (N. Guisinger, Electronic & Magnetic Materials & Devices Group) Measurement modes include: Contact and non-contact AFM Magnetic force microscopy (MFM) Scanning tunneling spectroscopy Preparation tools include: Resistive sample heating Direct current heating E-beam heating Sputter ion etching Gas dosing E-beam evaporation An analysis chamber contains combined four-grid LEED/Auger optics Omicron nanoprobe View high-resolution image Scanning probe/scanning electron microscopy: Omicron UHV Nanoprobe (N. Guisinger, Electronic & Magnetic Materials & Devices Group)

109

Atom probe microscopy of three-dimensional distribution of silicon isotopes in {sup 28}Si/{sup 30}Si isotope superlattices with sub-nanometer spatial resolution  

Science Conference Proceedings (OSTI)

Laser-assisted atom probe microscopy of 2 nm period {sup 28}Si/{sup 30}Si isotope superlattices (SLs) is reported. Three-dimensional distributions of {sup 28}Si and {sup 30}Si stable isotopes are obtained with sub-nanometer spatial resolution. The depth resolution of the present atom probe analysis is much higher than that of secondary ion mass spectrometry (SIMS) even when SIMS is performed with a great care to reduce the artifact due to atomic mixing. Outlook of Si isotope SLs as ideal depth scales for SIMS and three-dimensional position standards for atom probe microscopy is discussed.

Shimizu, Yasuo; Kawamura, Yoko; Uematsu, Masashi; Itoh, Kohei M. [School of Fundamental Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522 (Japan); Tomita, Mitsuhiro [Corporate Research and Development Center, Toshiba Corporation, 8 Shinsugita-cho, Isogo-ku, Yokohama 235-8522 (Japan); Sasaki, Mikio; Uchida, Hiroshi; Takahashi, Mamoru [Toshiba Nanoanalysis Corporation, 1 Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8583 (Japan)

2009-10-01T23:59:59.000Z

110

Scanning Electron Microscopy  

Science Conference Proceedings (OSTI)

... Bob Gordon of Hitachi explains that the electrons are produced by a tungsten filament, just like in an incandescent light bulb, but since the sample ...

2013-12-06T23:59:59.000Z

111

Scanning Tunneling Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Research Lab, MC 704 Urbana, IL 61801 217-244-4861 abbamont@illinois.edu Ian S. Anderson Oak Ridge National Laboratory Neutron Sciences Directorate P.O. Box 2008, MS 6477 Oak...

112

Nanoscale magnetic field mapping with a single spin scanning probe magnetometer  

SciTech Connect

We demonstrate quantitative magnetic field mapping with nanoscale resolution, by applying a lock-in technique on the electron spin resonance frequency of a single nitrogen-vacancy defect placed at the apex of an atomic force microscope tip. In addition, we report an all-optical magnetic imaging technique which is sensitive to large off-axis magnetic fields, thus extending the operation range of diamond-based magnetometry. Both techniques are illustrated by using a magnetic hard disk as a test sample. Owing to the non-perturbing and quantitative nature of the magnetic probe, this work should open up numerous perspectives in nanomagnetism and spintronics.

Rondin, L.; Tetienne, J.-P.; Spinicelli, P.; Roch, J.-F.; Jacques, V. [Laboratoire de Photonique Quantique et Moleculaire, Ecole Normale Superieure de Cachan and CNRS UMR 8537, 94235 Cachan Cedex (France); Dal Savio, C.; Karrai, K. [Attocube systems AG, Koeniginstrasse 11A RGB, Munich 80539 (Germany); Dantelle, G. [Laboratoire de Physique de la Matiere Condensee, Ecole Polytechnique and CNRS UMR 7643, 91128 Palaiseau (France); Thiaville, A.; Rohart, S. [Laboratoire de Physique des Solides, Universite Paris-Sud and CNRS UMR 8502, 91405 Orsay (France)

2012-04-09T23:59:59.000Z

113

Atomic-resolution study of polarity reversal in GaSb grown on Si by scanning transmission electron microscopy  

SciTech Connect

The atomic-resolved reversal of the polarity across an antiphase boundary (APB) was observed in GaSb films grown on Si by high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The investigation of the interface structure at the origin of the APB reveals that coalescence of two domains with Ga-prelayer and Sb-prelayer causes the sublattice reversal. The local strain and lattice rotation distributions of the APB, attributed to the discordant bonding length at the APB with the surrounding GaSb lattice, were further studied using the geometric phase analysis technique. The crystallographic characteristics of the APBs and their interaction with other planar defects were observed with HAADF-STEM. The quantitative agreement between experimental and simulated images confirms the observed polarities in the acquired HAADF-STEM data. The self-annihilation mechanism of the APBs is addressed based on the rotation induced by anti-site bonds and APBs' faceting.

Hosseini Vajargah, S.; Woo, S. Y.; Botton, G. A. [Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Ghanad-Tavakoli, S. [Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Kleiman, R. N.; Preston, J. S. [Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Department of Engineering Physics, McMaster University, Hamilton, Ontario L8S 4L7 (Canada)

2012-11-01T23:59:59.000Z

114

Atom-probe field-ion-microscopy study of Fe-Ti alloys  

DOE Green Energy (OSTI)

A newly developed high-performance atom-probe (field ion microscope) was employed for the composition analysis of Fe-Ti alloys and their interactions with ambient gas, such as H/sub 2/ and O/sub 2/. With a mass resolution (m/..delta..m) better than 2000 and a spatial resolution of a few A, all isotopes of Fe and Ti and their hydrides and other compounds are clearly resolved during the depth profile study. Some of our findings are: (1) Titanium segregated on the surface and grain boundaries upon heating (greater than or equal to 900/sup 0/C), in the form of oxides, and (2) some Ti in the bulk forms clusters of various sizes with C, O, and/or N as nuclei.

Pickering, H.W.; Kuk, Y.; Sakurai, T.

1980-01-01T23:59:59.000Z

115

Structure of Au on Ag(110) studied by scanning tunneling microscopy S. Chiang, S. Rousset,a) D. E. Fowler, and D. D. Chambliss  

E-Print Network (OSTI)

Structure of Au on Ag(110) studied by scanning tunneling microscopy S. Chiang, S. Rousset,a) D. E/12(3)/1747/4/$1.00 @1994 American Vacuum Society 1747 #12;1748 Chiang et 81.: Structure of Au on Ag(110) studied by STM Fll 10 min apart; #12;1749 Chiang et al.: Structure of Au on Ag(110) studied by STM FIG. 3. (a) -2 ML Au

Chiang, Shirley

116

Scanning Probe Recognition Microscopy -A New Tool for Quantitative Mapping of Nanoscale Properties in Regenerative Neural Cell Systems  

E-Print Network (OSTI)

in Regenerative Neural Cell Systems Virginia M. Ayres, V. Tiryaki, Michigan State University; A. Khan, Western) [2] Astrocytes on 2D substrates have a pathological morphology (A). Astrocytes on 3D nanofibrillar Purdue University, and her B.A. in Physics and Biophysics from the Johns Hopkins University. She

Ayres, Virginia

117

Aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy studies of epitaxial Fe/MgO/(001)Ge heterostructures  

SciTech Connect

Aberration correction in the scanning transmission electron microscope combined with electron energy loss spectroscopy allows simultaneous mapping of the structure, the chemistry and even the electronic properties of materials in one single experiment with spatial resolutions of the order of one Angstrom. Here the authors will apply these techniques to the characterization of epitaxial Fe/MgO/(001)Ge and interfaces with possible applications for tunneling junctions, and the authors will show that epitaxial MgO films can be grown on a (001)Ge substrates by molecular beam epitaxy and how it is possible to map the chemistry of interfaces with atomic resolution. Epitaxial growth of insulator oxides on semiconductors constitutes a key issue within the field of electronics, and a considerably large effort has been devoted to harness the growth of high-k oxides on Si. Ge, due to its high electronic and hole mobility, is a very interesting alternative as a potential substrate for future high performance complementary metal-oxide-semiconductor field-effect transistors. However, a major issue is to avoid the high resistivity at the source and drain contacts ensuing from the pinning of the Fermi level at the valence-band maximum. It has been suggested that this problem could be fixed by depositing a thin insulating tunneling barrier between the Ge substrate and the metal contacts. In this case, single crystal epitaxy would represent an additional benefit, since it would lead to a reduction of interfacial defects and improved performance of the tunneling barrier. MgO has been suggested to fulfill such requisites. Furthermore, MgO has been demonstrated to be a good substrate for epitaxial growth of transition metals thin films, such as Fe and Co, thus avoiding the potential problem of chemical reactivity with Ge. In such a scenario, epitaxial deposition of high quality MgO films on Ge substrates is highly desirable. But in addition, successful epitaxial growth of MgO on a semiconductor would also constitute a plus for applications in spintronics, since the injection of a spin polarized current from a ferromagnetic electrode to a non-magnetic semiconductor requires the presence of a potential barrier. MgO represents a convenient choice because the symmetry filtering properties at the interface with transition metals would allow an efficient spin filtering effect. For this approach to succeed, a suitable semiconducting substrate where MgO can be grown epitaxially must be found. And again, while GaAs and Si have been investigated for such role, Ge has not received much attention so far. In this study the authors report on the atomic resolution characterization of high quality interfaces in Fe/MgO/(001)Ge heterostructures. The study of the defects, the inhomogeneities and the interface structure of such junctions is a must to pave the way toward future applications. For this aim, the combination of scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) is a most useful tool, since it allows these features to be probed with atomic resolution. Spherical aberration correction in the STEM allows for increased contrast, allowing even single atoms to be detected both in imaging and spectroscopy.

Gazquez Alabart, Jaume [ORNL; Varela del Arco, Maria [ORNL; Petti, D. [Politecnico di Milano; Cantoni, M. [Politecnico di Milano; Rinaldi, C. [Politecnico di Milano; Brivio, S. [Politecnico di Milano; Bertacco, R. [Politecnico di Milano

2011-01-01T23:59:59.000Z

118

Scanning ultrasonic probe  

DOE Patents (OSTI)

The invention is an ultrasonic testing device for rapid and complete examination of the test specimen, and is particularly well suited for evaluation of tubular test geometries. A variety of defect categories may be detected and anlayzed at one time and their positions accurately located in a single pass down the test specimen.

Kupperman, D.S.; Reimann, K.J.

1980-12-09T23:59:59.000Z

119

Scanning ultrasonic probe  

DOE Patents (OSTI)

The invention is an ultrasonic testing device for rapid and complete examination of the test specimen, and is particularly well suited for evaluation of tubular test geometries. A variety of defect categories may be detected and analyzed at one time and their positions accurately located in a single pass down the test specimen.

Kupperman, David S. (Oak Park, IL); Reimann, Karl J. (Lisle, IL)

1982-01-01T23:59:59.000Z

120

In-situ monitoring of electron beam induced deposition by atomic force microscopy in a scanning electron microscope  

Science Conference Proceedings (OSTI)

A new type of atomic force microscope is proposed for atomic force microscopic analysis inside a scanning electron microscope. We attached a piezoresisitive atomic force microscopic cantilever to a micro manipulator to achieve a compact and guidable ... Keywords: atomic force, electron beam induced deposition, in-situ monitoring, local gas injection, micro manipulator, microscope

S. Bauerdick; C. Burkhardt; R. Rudorf; W. Barth; V. Bucher; W. Nisch

2003-06-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


121

High resolution scanning tunnelling microscopy and extended x-ray-absorption fine structure study of the (533) silicide structure on Cu(001)  

E-Print Network (OSTI)

Using low energy electron diffraction (LEED), scanning tunnelling microscopy (STM) and x-ray absorption spectroscopy (XAS) techniques, we have studied the first steps of silicon adsorption onto Cu (001) single crystal substrate. For low coverage (~ 0.5 ML) and after annealing at 100{\\deg}C, STM images and LEED patterns reveal the formation of an ordered quasi commensurate superstructure. From a quantitative analysis of XAS data, we extract the Si-Cu distance and detail the local atomic arrangement of the structure.

B. Lalmi; M. Chorro; R. Belkhou

2013-08-09T23:59:59.000Z

122

Computer-Controlled Scanning Electron Microscopy (CCSEM) Investigation of Respirable Quartz in Air Samples Collected During Power Plant Maintenance Activities  

Science Conference Proceedings (OSTI)

Reliable methods of determining the amount of respirable, crystalline silica (quartz) in coal fly ash (CFA) are clearly of interest in order to satisfy Occupational Safety and Health Administration (OSHA) regulations and to accurately assess the potential risks of workers with prolonged CFA exposure to certain respiratory diseases. Earlier EPRI-sponsored research focused on development of a new method for determining the amount of respirable quartz in bulk CFA samples using computer-controlled scanning e...

2008-12-08T23:59:59.000Z

123

MML Microscopy Facility  

Science Conference Proceedings (OSTI)

The MML Electron Microscopy Facility consists of three transmission electron microscopes (TEM), three scanning electron microscopes (SEM), a ...

2013-06-11T23:59:59.000Z

124

Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope  

SciTech Connect

We demonstrate that a transmission electron microscope fitted with two spherical-aberration correctors can be operated as an energy-filtered scanning confocal electron microscope. A method for establishing this mode is described and initial results showing 3D chemical mapping with nanoscale sensitivity to height and thickness changes in a carbon film are presented. Importantly, uncorrected chromatic aberration does not limit the depth resolution of this technique and moreover performs an energy-filtering role, which is explained in terms of a combined depth and energy-loss response function.

Wang Peng; Behan, Gavin; Kirkland, Angus I.; Nellist, Peter D. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Takeguchi, Masaki; Hashimoto, Ayako; Mitsuishi, Kazutaka [National Institute for Materials Science, 3-13 Sakura, Tsukuba, 305-0003 (Japan); Shimojo, Masayuki [Advanced Science Research Laboratory, Saitama Institute of Technology, 1690 Fusaiji, Fukaya 369-0293 (Japan)

2010-05-21T23:59:59.000Z

125

Classification of Multiple Types of Organic Carbon Composition in Atmospheric Particles by Scanning Transmission X-Ray Microscopy Analysis  

Science Conference Proceedings (OSTI)

A scanning transmission X-ray microscope at the Lawrence Berkeley National Laboratory is used to measure organic functional group abundance and morphology of atmospheric aerosols. We present a summary of spectra, sizes, and shapes observed in 595 particles that were collected and analyzed between 2000 and 2006. These particles ranged between 0.1 and 12 mm and represent aerosols found in a large range of geographical areas, altitudes, and times. They include samples from seven different field campaigns: PELTI, ACE-ASIA, DYCOMS II, Princeton, MILAGRO (urban), MILAGRO (C-130), and INTEX-B. At least 14 different classes of organic particles show different types of spectroscopic signatures. Different particle types are found within the same region while the same particle types are also found in different geographical domains. Particles chemically resembling black carbon, humic-like aerosols, pine ultisol, and secondary or processed aerosol have been identified from functional group abundance and comparison of spectra with those published in the literature.

Kilcoyne, Arthur L; Takahama, S.; Gilardoni, S.; Russell, L.M.; Kilcoyne, A.L.D.

2007-05-16T23:59:59.000Z

126

Synchrotron radiation based cross-sectional scanning photoelectron microscopy and spectroscopy of n-ZnO:Al/p-GaN:Mg heterojunction  

Science Conference Proceedings (OSTI)

Al-doped ZnO (AZO) deposited by radio frequency co-sputtering is formed on epitaxial Mg-doped GaN template at room temperature to achieve n-AZO/p-GaN heterojunction. Alignment of AZO and GaN bands is investigated using synchrotron radiation based cross-sectional scanning photoelectron microscopy and spectroscopy on the nonpolar side-facet of a vertically c-axis aligned heterostructure. It shows type-II band configuration with valence band offset of 1.63 {+-} 0.1 eV and conduction band offset of 1.61 {+-} 0.1 eV, respectively. Rectification behavior is clearly observed, with a ratio of forward-to-reverse current up to six orders of magnitude when the bias is applied across the p-n junction.

Lee, Kai-Hsuan; Chen, Chia-Hao [Nano Science Group, National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan (China)] [Nano Science Group, National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan (China); Chang, Ping-Chuan [Department of Electro-Optical Engineering, Kun Shan University, Dawan Rd. 949, 71003 Tainan, Taiwan (China)] [Department of Electro-Optical Engineering, Kun Shan University, Dawan Rd. 949, 71003 Tainan, Taiwan (China); Chen, Tse-Pu; Chang, Sheng-Po; Chang, Shoou-Jinn [Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, University Rd. 1, 70101 Tainan, Taiwan (China)] [Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, University Rd. 1, 70101 Tainan, Taiwan (China); Shiu, Hung-Wei; Chang, Lo-Yueh [Nano Science Group, National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan (China) [Nano Science Group, National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan (China); Department of Physics, National Tsing Hua University, Kuang-Fu Rd. 101, 30013 Hsinchu, Taiwan (China)

2013-02-18T23:59:59.000Z

127

Growth and structure of water on SiO2 films on Si investigated byKelvin probe microscopy and in situ X-ray Spectroscopies  

SciTech Connect

The growth of water on thin SiO{sub 2} films on Si wafers at vapor pressures between 1.5 and 4 torr and temperatures between -10 and 21 C has been studied in situ using Kelvin Probe Microscopy and X-ray photoemission and absorption spectroscopies. From 0 to 75% relative humidity (RH) water adsorbs forming a uniform film 4-5 layers thick. The surface potential increases in that RH range by about 400 mV and remains constant upon further increase of the RH. Above 75% RH the water film grows rapidly, reaching 6-7 monolayers at around 90% RH and forming a macroscopic drop near 100%. The O K-edge near-edge X-ray absorption spectrum around 75% RH is similar to that of liquid water (imperfect H-bonding coordination) at temperatures above 0 C and ice-like below 0 C.

Verdaguer, A.; Weis, C.; Oncins, G.; Ketteler, G.; Bluhm, H.; Salmeron, M.

2007-06-14T23:59:59.000Z

128

Real-time scanning tunneling microscopy observations of the oxidation of a Ti/Pt(111)-(2x2) surface alloy using O{sub 2} and NO{sub 2}  

SciTech Connect

The authors have used scanning tunneling microscopy (STM), low energy electron diffraction (LEED), and Auger electron spectroscopy (AES) to study the nascent oxidation of an ordered Ti/Pt(111)-(2x2) surface alloy exposed to oxygen (O{sub 2}) or nitrogen dioxide (NO{sub 2}) under ultrahigh vacuum conditions. The Ti/Pt(111)-(2x2) surface alloy was formed by depositing an ultrathin Ti film on Pt(111) and annealing to 1050 K. This produces an alloy film in which the surface layer is pure Pt and the second layer contains Ti atoms in a (2x2) structure, which causes the pattern observed by STM and LEED. Real-time imaging of the surface at 300 K was carried out by continuously scanning with the STM while either O{sub 2} or NO{sub 2} was introduced into the chamber. O{sub 2} exposures did not cause any gross structural changes; however oxygen was detected on the surface afterward using AES. Annealing this surface to 950 K resulted in the formation of an ordered TiO{sub x} overlayer as characterized by both LEED and STM. In contrast, NO{sub 2} exposures caused definite changes in the surface morphology at 300 K, and the root-mean-square roughness increased from 3.5 to 7.1 A after a large NO{sub 2} exposure. No ordered structures were produced by this treatment, but annealing the surface to 950 K formed an ordered pattern in LEED and corresponding clear, well-resolved structures in STM images. We account for these observations on the disruption or reconstruction of the Ti/Pt(111)-(2x2) surface alloy by arguments recalling that Ti oxidation is an activated process. The energetic barrier to TiO{sub x} formation cannot be surmounted at room temperature at low oxygen coverages, and annealing the surface was necessary to initiate this reaction. However, the higher oxygen coverages obtained using the more reactive oxidant NO{sub 2} lowered the chemical potential in the system sufficiently to overcome the activation barrier to extract Ti from the alloy at room temperature and form a disordered TiO{sub x} film. These results illustrate the importance of the surface oxygen coverage in nucleating the room temperature oxidation of the Pt-Ti surface alloys and further show the ability of NO{sub 2} in ultrahigh vacuum studies for probing the chemistry that will occur at higher O{sub 2} pressure.

Hsieh Shuchen; Liu, G. F.; Koel, Bruce E. [Center for Nanoscience and Nanotechnology, Department of Chemistry, National Sun Yat-Sen University, Kaohsiung, Taiwan (China); Department of Chemistry, Lehigh University, Bethlehem, Pennsylvania 18015-3172 (United States)

2008-09-15T23:59:59.000Z

129

Spectroscopy and atomic force microscopy of biomass  

NLE Websites -- All DOE Office Websites (Extended Search)

Spectroscopy Spectroscopy and atomic force microscopy of biomass L. Tetard a,b , A. Passian a,b,n , R.H. Farahi a , U.C. Kalluri c , B.H. Davison c , T. Thundat a,b a Biosciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA b Department of Physics, University of Tennessee, Knoxville, TN 37996, USA c Environmental Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA a r t i c l e i n f o Keywords: Atomic force microscopy Spectroscopy Plant cells Biomass Nanomechanics a b s t r a c t Scanning probe microscopy has emerged as a powerful approach to a broader understanding of the molecular architecture of cell walls, which may shed light on the challenge of efficient cellulosic ethanol production. We have obtained preliminary images of both Populus and switchgrass samples using atomic force microscopy (AFM). The results show distinctive features that are shared by switchgrass

130

Novel Approaches to Soft X-ray Spectroscopy: Scanning TransmissionX-ray Microscopy and Ambient Pressure X-Ray PhotoelectronSpectroscopy  

Science Conference Proceedings (OSTI)

This workshop focused on novel spectroscopies at Beamlines 11.0.2, 5.3.2 and 9.3.2 at the ALS. The workshop brought together users from a wide range of fields to highlight recent experimental and technical developments both in scanning transmission X-ray spectroscopy (STXM) and ambient pressure photoelectron spectroscopy (APPES). The morning session featured talks on experiments involving new developments at the STXM, while the afternoon session was devoted to those using APXPS. In the morning session, Tolek Tyliszczak discussed the improved detector developments at the STXM, such as an avalanche photodiode detector and fluorescence and electron detection, as well as the continued development of in situ cells for heating, gas flow, and electrochemical cells. Of these, only the avalanche photodiode in combination with a novel multichannel photon-counting system is in routine use in time-resolved studies. Bartel Van Waeyenberge (Ghent University) presented results of magnetic imaging with a time resolution of 70-100 ps combined with a lateral resolution of 20-40 nm performed with the STXM (Beamline 11.0.2). As a complement to the time-domain ''pump-and-probe'' measurements, they developed a frequency-domain ''sine-excitation'' technique in order to study specific eigenmodes of these ferromagnetic patterns with high spatial resolution. This new approach was used to study the gyrotropic vortex motions in micron-sized ferromagnetic patterns. Adam Hitchcock (McMaster University) presented the development, in collaboration with Daniel Guay (INRS, Varennes) and Sherry Zhang, of the apparatus and techniques for applying STXM to in-situ studies of electrochemistry, in particular electrochromism in polyaniline. In addition, substantial progress was reported on a joint project to develop substrates and methods for chemically selective lithography of multilayer polymer systems. Selective patterns, such as that displayed in the figure, can now be written efficiently with the bend magnet STXM on Beamline 5.3.2. Yves Acremann (SSRL) discussed time and spatially resolved X-ray magnetic circular dichroism (XMCD) experiments on spin transfer devices at the STXM (Beamline 11.0.2). These elegant experiments explore time resolved measurements of the magnetization dynamics within a 100 x 150 nm sample influenced by a spin-polarized current. This experiment shows that the magnetization in these magnetic nanostructures are not uniform, as they are influenced by the Oersted field of the charge current needed to generate the spin current. The implementation of a novel multichannel photon counting system in combination with an avalanche photon detector decreased the data-acquisition time by a factor of 10, owing to its ability to resolve the structure of multi bunch mode. Gordon E. Brown, Jr. (Stanford University and SSRL) described ''Applications of STXM to Microbial Bioweathering and Biomineralization''. In the interaction of bacteria with ferrihydrite nanoparticles, microenvironments that were very different than the bulk material were observed, showing that bulk thermodynamics may not be useful for predicting micro phases. Gordon also presented work showing that iron nanoparticles are attracted to the negatively charged bacteria and form a coating that reduces iron oxide minerals. The afternoon session started with presentations by Simon Mun and Hendrik Bluhm, who discussed the current status and the future plans for the two APPES end-stations at the ALS, which are located at Beamlines 9.3.2 and 11.0.2, respectively. In both end-stations, samples can be measured in gaseous environments at pressures of up to several Torr, which makes possible the investigation of numerous phenomena, in particular in the fields of atmospheric and environmental science as well as heterogeneous catalysis. Specific examples of the application of APPES were shown in the following presentations. John Hemminger (University of California, Irvine) reported on APPES investigations at Beamlines 9.3.2 and 11.0.2 of the interaction of alkali halide surfaces with water. The m

Bluhm, Hendrik; Gilles, Mary K.; Mun, Simon B.; Tyliszczak, Tolek

2006-02-01T23:59:59.000Z

131

Influence of Surface Preparation on Scanning Kelvin Probe Microscopy and Electron Backscatter Diffraction Analysis of Cross Sections of CdTe/CdS Solar Cells: Preprint  

DOE Green Energy (OSTI)

In this work we investigated different methods to prepare cross sections of CdTe/CdS solar cells for EBSD and SKPM analyses. We observed that procedures used to prepare surfaces for EBSD are not suitable to prepare cross sections, and we were able to develop a process using polishing and ion-beam milling. This process resulted in very good results and allowed us to reveal important aspects of the cross section of the CdTe film. For SKPM, polishing and a light ion-beam milling resulted in cross sections that provided good data. We were able to observe the depletion region on the CdTe film and the p-n junction as well as the interdiffusion layer between CdTe and CdS. However, preparing good-quality cross sections for SKPM is not a reproducible process, and artifacts are often observed.

Moutinho, H. R.; Dhere, R. G.; Jiang, C. S.; Al-Jassim, M. M.

2011-06-01T23:59:59.000Z

132

April Conferences Focus on Scanning Advances  

Science Conference Proceedings (OSTI)

... of the scanning electron microscope (SEM) in ... and helium ion microscopes— have unlocked ... of SEM, scanning ion microscopy, quality assurance in ...

2011-07-19T23:59:59.000Z

133

Near-Field Microscopy Through a SiC Superlens  

E-Print Network (OSTI)

Near-Field Microscopy Through a SiC Superlens Thomas Taubner,1 * Dmitriy Korobkin,2 Yaroslav of the slab (4­6). In our experiment, we placed a SiC superlens (7) between the scan- ning probe tip-crystalline SiC membrane coated on both sides with 220-nm-thick SiO2 layers (7). The two surfaces of the sandwich

Shvets, Gennady

134

A Networked Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

Featured Overview. A New Paradigm—Multi-User Scanning Electron Microscopy. L.S. Chumbley, M. Meyer, K. Fredrickson, and F.C. Laabs. Introduction; System ...

135

Basic Design of the Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

...H.E. Exner and S. Weinbruch, Scanning Electron Microscopy, Metallography and Microstructures, Vol 9, ASM Handbook,

136

Advantages of Integrating Precession Scanning Transmission ...  

Science Conference Proceedings (OSTI)

Presentation Title, Advantages of Integrating Precession Scanning Transmission Electron Microscopy in the Characterization of Metallic Materials. Author(s) ...

137

Electron Microscopy (EM, TEM, SEM, STEM) Information at ...  

Science Conference Proceedings (OSTI)

... Electron holography. Electron Microscopy of Carbon Nanotube Composites. Environmental Scanning Electron Microscope. ...

2010-10-05T23:59:59.000Z

138

End station for nanoscale magnetic materials study: Combination of scanning tunneling microscopy and soft X-ray magnetic circular dichroism spectroscopy  

SciTech Connect

We have constructed an end station for nanoscale magnetic materials study at the soft X-ray beamline HiSOR BL-14 at Hiroshima Synchrotron Radiation Center. An ultrahigh-vacuum scanning tunneling microscope (STM) was installed for an in situ characterization of nanoscale magnetic materials in combination with soft X-ray magnetic circular dichroism (XMCD) spectroscopy experiment. The STM was connected to the XMCD experimental station via damper bellows to isolate it from environmental vibrations, thus achieving efficient spatial resolution for observing Si(111) surface at atomic resolution. We performed an in situ experiment with STM and XMCD spectroscopy on Co nanoclusters on an Au(111) surface and explored its practical application to investigate magnetic properties for well-characterized nanoscale magnetic materials.

Ueno, Tetsuro; Sawada, Masahiro; Namatame, Hirofumi [Hiroshima Synchrotron Radiation Center, Hiroshima University, 2-313 Kagamiyama, Higashi-Hiroshima 739-0046 (Japan); Kishimizu, Yusuke; Kimura, Akio [Graduate School of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); Taniguchi, Masaki [Hiroshima Synchrotron Radiation Center, Hiroshima University, 2-313 Kagamiyama, Higashi-Hiroshima 739-0046 (Japan); Graduate School of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan)

2012-12-15T23:59:59.000Z

139

Ultrafast supercontinuum fiber-laser based pump-probe scanning MOKE microscope for the investigation of electron spin dynamics in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution  

E-Print Network (OSTI)

We describe a two-color pump-probe scanning magneto-optical Kerr effect (MOKE) microscope which we have developed to investigate electron spin phenomena in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution. The key innovation of our microscope is the usage of an ultrafast `white light' supercontinuum fiber-laser source which provides access to the whole visible and near-infrared spectral range. Our Kerr microscope allows for the independent selection of the excitation and detection energy while avoiding the necessity to synchronize the pulse trains of two separate picosecond laser systems. The ability to independently tune the pump and probe wavelength enables the investigation of the influence of excitation energy on the optically induced electron spin dynamics in semiconductors. We demonstrate picosecond real-space imaging of the diffusive expansion of optically excited electron spin packets in a (110) GaAs quantum well sample to illustrate the capabilities of t...

Henn, T; Ossau, W; Molenkamp, L W; Biermann, K; Santos, P V

2013-01-01T23:59:59.000Z

140

In situ investigation of ion-induced dewetting of a thin iron-oxide film on silicon by high resolution scanning electron microscopy  

SciTech Connect

Using our new in situ high resolution scanning electron microscope, which is integrated into the UNILAC ion beamline at the Helmholtzzentrum fuer Schwerionenforschung (GSI) in Darmstadt, Germany, we investigated the swift heavy ion induced dewetting of a thin iron oxide layer on Si. Besides heterogeneous hole nucleation at defects and spontaneous (homogeneous) hole nucleation, we could clearly identify a dewetting mechanism, which is similar to the spinodal dewetting observed for liquid films. Instead of being due to capillary waves, it is based on a stress induced surface instability. The latter results in the formation of a wavy surface with constant dominant wave-length and increasing amplitude during ion irradiation. Dewetting sets in as soon as the wave-troughs reach the film-substrate interface. Inspection of the hole radii and rim shapes indicates that removal of the material from the hole area occurs mainly by plastic deformation at the inner boundary and ion induced viscous flow in the peripheral zone due to surface tension.

Amirthapandian, S. [Institut fuer Halbleiteroptik und Funktionelle Grenzflaechen, Universitaet Stuttgart, 70569 Stuttgart (Germany); Material Physics Division, Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India); Schuchart, F.; Garmatter, D.; Bolse, W. [Institut fuer Halbleiteroptik und Funktionelle Grenzflaechen, Universitaet Stuttgart, 70569 Stuttgart (Germany)

2012-11-15T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


141

Spectroscopic imaging in electron microscopy  

Science Conference Proceedings (OSTI)

In the scanning transmission electron microscope, multiple signals can be simultaneously collected, including the transmitted and scattered electron signals (bright field and annular dark field or Z-contrast images), along with spectroscopic signals such as inelastically scattered electrons and emitted photons. In the last few years, the successful development of aberration correctors for the electron microscope has transformed the field of electron microscopy, opening up new possibilities for correlating structure to functionality. Aberration correction not only allows for enhanced structural resolution with incident probes into the sub-angstrom range, but can also provide greater probe currents to facilitate mapping of intrinsically weak spectroscopic signals at the nanoscale or even the atomic level. In this issue of MRS Bulletin, we illustrate the power of the new generation of electron microscopes with a combination of imaging and spectroscopy. We show the mapping of elemental distributions at atomic resolution and also the mapping of electronic and optical properties at unprecedented spatial resolution, with applications ranging from graphene to plasmonic nanostructures, and oxide interfaces to biology.

Pennycook, Stephen J [ORNL; Colliex, C. [Universite Paris Sud, Orsay, France

2012-01-01T23:59:59.000Z

142

Scanning electron microscopy imaging of hydraulic cement ...  

Science Conference Proceedings (OSTI)

... Cement clinker is manufactured from a finely-ground, homogenized blend of limestone, shale and iron ore sintered in a rotary kiln to temperatures ...

2004-11-23T23:59:59.000Z

143

Scanning Electron Microscopy Education Outreach Program  

Science Conference Proceedings (OSTI)

May 1, 2007 ... TMS Member price: 10.00. Non-member price: 25.00. TMS Student Member price : 10.00. Product In Stock. Description This paper describes an ...

144

Aberration-Corrected Scanning Transmission Electron Microscopy ...  

Science Conference Proceedings (OSTI)

... hydrogen production by steam reforming of methanol and oxidation of CO for low ... Recent Developments in In Situ Studies of Catalytic Materials at Atomic ...

145

Scanning He Ion Beam Microscopy and Metrology  

Science Conference Proceedings (OSTI)

... Damage to polymers is less severe ... 29 Charging is controlled by an electron flood gun aimed at the specimen – ... polymer film even at low doses ...

2011-10-03T23:59:59.000Z

146

Epitaxial BaTiO{sub 3}(100) films on Pt(100): A low-energy electron diffraction, scanning tunneling microscopy, and x-ray photoelectron spectroscopy study  

Science Conference Proceedings (OSTI)

The growth of epitaxial ultrathin BaTiO{sub 3} films on a Pt(100) substrate has been studied by scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and x-ray photoelectron spectroscopy (XPS). The films have been prepared by radio-frequency-assisted magnetron sputter deposition at room temperature and develop a long-range order upon annealing at 900 K in O{sub 2}. By adjusting the Ar and O{sub 2} partial pressures of the sputter gas, the stoichiometry was tuned to match that of a BaTiO{sub 3}(100) single crystal as determined by XPS. STM reveals the growth of continuous BaTiO{sub 3} films with unit cell high islands on top. With LEED already for monolayer thicknesses, the formation of a BaTiO{sub 3}(100)-(1 x 1) structure has been observed. Films of 2-3 unit cell thickness show a brilliant (1 x 1) LEED pattern for which an extended set of LEED I-V data has been acquired. At temperatures above 1050 K the BaTiO{sub 3} thin film starts to decay by formation of vacancy islands. In addition (4 x 4) and (3 x 3) surface reconstructions develop upon prolonged heating.

Foerster, Stefan; Huth, Michael; Schindler, Karl-Michael; Widdra, Wolf [Institute of Physics, Martin-Luther-Universitaet Halle-Wittenberg, Halle (Germany)

2011-09-14T23:59:59.000Z

147

Combining Discrete Dislocation Dynamics with Scanning ...  

Science Conference Proceedings (OSTI)

Abstract Scope, Scanning transmission electron microscopy (STEM) is a powerful ... Deformation and Annealing in Zr-2.5Nb by Diffraction Line Profile Analysis.

148

Multifocal Multiphoton Laser-Scanning Structured Illumination ...  

Multifocal Multiphoton Laser-Scanning Structured Illumination Microscopy with Whole-Field Detection Colorado School of Mines. Contact CSM About This Technology

149

Dielectric microscopy with submillimeter resolution  

E-Print Network (OSTI)

In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying dielectric properties of materials with sub-wavelength resolution; using a 150 GHz probe in transmision mode we see spatial resolution of around 500 microns. We have applied this method to a variety of highly heterogeneous materials. Here we show dielectric maps of granite and oil shale.

Nathan S. Greeney; John A. Scales

2007-06-20T23:59:59.000Z

150

Microscopy Methods  

Science Conference Proceedings (OSTI)

... NIST has worked extensively with microscope manufacturers such as FEI ... Electron microscopy methods have been used to characterize potential ...

2012-10-05T23:59:59.000Z

151

Scanned probe characterization of semiconductor nanostructures  

E-Print Network (OSTI)

V. Smith, E. T. Yu, J. M. Redwing, and K. S. Boutros, Appl.Miller, E. T. Yu, and J. M. Redwing, Appl. Phys. Lett. 78 ,J. Van Hove, and J. M. Redwing, Electron. Lett. 33 , 1230 (

Law, James Jeremy MacDonald

2009-01-01T23:59:59.000Z

152

Traceable Scanning Probe Nano-Characterization  

Science Conference Proceedings (OSTI)

... Develop and deliver measurements, standards, and infrastructural technologies that address ... Development of new metrology methods for ...

2013-05-08T23:59:59.000Z

153

NIST's New Scanning Probe Microscope is Supercool  

Science Conference Proceedings (OSTI)

... The microscope is mounted on a 6-ton granite table (4), also supported by pneumatic isolators. The cryostat (5) is mounted ...

2011-01-03T23:59:59.000Z

154

Scanning Probe Techniques for Functional Materials  

Science Conference Proceedings (OSTI)

Nanoscale Electromechanical Properties of Novel Materials for Actuator and Energy Harvesting Applications · Optical Imaging of Dielectric Nano-structures with ...

155

Positron microscopy  

Science Conference Proceedings (OSTI)

The negative work function property that some materials have for positrons make possible the development of positron reemission microscopy (PRM). Because of the low energies with which the positrons are emitted, some unique applications, such as the imaging of defects, can be made. The history of the concept of PRM, and its present state of development will be reviewed. The potential of positron microprobe techniques will be discussed also.

Hulett, L.D. Jr.; Xu, J.

1995-02-01T23:59:59.000Z

156

Simulating scanning tunneling microscope measurements  

E-Print Network (OSTI)

One of the largest problems in scanning tunneling microscopy design is noise control. It is the burden of the designer to determine if money should be used to build a floating room for vibration isolation or for top-of-the-line ...

Venkatachalam, Vivek

2006-01-01T23:59:59.000Z

157

Free Motion Scanning System  

DOE Patents (OSTI)

The present invention relates to an ultrasonic scanner and method for the imaging of a part surface, the scanner comprising: a probe assembly spaced apart from the surface including at least two tracking signals for emitting electromagnetic radiation and a transmitter for emitting ultrasonic waves onto a surface in order to induce at least a portion of said waves to be reflected from the surface, at least one detector for receiving the electromagnetic radiation wherein the detector is positioned to receive said radiation from the tracking signals, an analyzing means for recognizing a three-dimensional location of the tracking signals based on said emitted electromagnetic radiation, a differential conversion means for generating an output signal representative of the waveform of the reflected waves, and a means for relating said tracking signal location with the output signal and projecting an image of the resulting data. The scanner and method are particularly useful to acquire ultrasonic inspection data by scanning the probe-over a complex part surface in an arbitrary scanning pattern.

Sword, Charles K.

1998-06-18T23:59:59.000Z

158

Mapping Ionic Currents and Reactivity on the Nanoscale: Electrochemical Strain Microscopy  

DOE Green Energy (OSTI)

Solid-state electrochemical processes in oxides underpin a broad spectrum of energy and information storage devices, ranging from Li-ion and Li-air batteries, to solid oxide fuel cells (SOFC) to electroresistive and memristive systems. These functionalities are controlled by the bias-driven diffusive and electromigration transport of mobile ionic species, as well as intricate a set of electrochemical and defect-controlled reactions at interfaces and in bulk. Despite the wealth of device-level and atomistic studies, little is known on the mesoscopic mechanisms of ion diffusion and electronic transport on the level of grain clusters, individual grains, and extended defects. The development of the capability for probing ion transport on the nanometer scale is a key to deciphering complex interplay between structure, functionality, and performance in these systems. Here we introduce Electrochemical Strain Microscopy, a scanning probe microscopy technique based on strong strain-bias coupling in the systems in which local ion concentrations are changed by electrical fields. The imaging capability, as well as time- and voltage spectroscopies analogous to traditional current based electrochemical characterization methods are developed. The reversible intercalation of Li and mapping electrochemical activity in LiCoO2 is demonstrated, illustrating higher Li diffusivity at non-basal planes and grain boundaries. In Si-anode device structure, the direct mapping of Li diffusion at extended defects and evolution of Li-activity with charge state is explored. The electrical field-dependence of Li mobility is studied to determine the critical bias required for the onset of electrochemical transformation, allowing reaction and diffusion processes in the battery system to be separated at each location. Finally, the applicability of ESM for probing oxygen vacancy diffusion and oxygen reduction/evolution reactions is illustrated, and the high resolution ESM maps are correlated with aberration corrected scanning transmission electron microscopy imaging. The future potential for deciphering mechanisms of electrochemical transformations on an atomically-defined single-defect level is discussed.

Kalinin, S.V. (Center for Nanophase Materials Sciences, ORNL)

2010-10-19T23:59:59.000Z

159

Electron Microscopy | Center for Functional Nanomaterials  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Facility Electron Microscopy Facility Electron Microscopy This facility consists of four top-of-the line transmission electron microscopes, two of which are highly specialized instruments capable of extreme levels of resolution, achieved through spherical aberration correction. The facility is also equipped with extensive sample-preparation capabilities. The scientific interests of the staff focus on understanding the microscopic origin of the physical and chemical behavior of materials, with specific emphasis on in-situ studies of materials in native, functional environments. Capabilities Atomic-resolution imaging of internal materials structure with scanning transmission and transmission electron microscopy Spectroscopic characterization with energy dispersive x-ray

160

Recent Advances in Electron Microscopy, Spectral Imaging, and ...  

Science Conference Proceedings (OSTI)

... such as adhesion performance, corrosion resistance, electrical and magnetic ... and surface analysis techniques for probing the composition and structure of ... microscopy and energy dispersive X-ray spectroscopy (FESEM/STEM/EDS); ...

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


161

Short Course Agricultural Microscopy  

Science Conference Proceedings (OSTI)

Short Course in Agricultural Microscopy. Fargo North Dakota held June 13-16 2011. Sponsored by the Agricultural Microscopy Division of AOCS and the Great Plains Institute of Food Safety. Short Course Agricultural Microscopy Short Courses ...

162

Probe threshold and probe trivially perfect graphs  

Science Conference Proceedings (OSTI)

An undirected graph G=(V,E) is a probeC graph if its vertex set can be partitioned into two sets, N (nonprobes) and P (probes) where N is independent and there exists E^'@?NxN such that G^'=(V,E@?E^') is a C graph. In this article we investigate probe ... Keywords: 2-SAT, Graph class, Probe graphs, Probe interval, Probe threshold, Probe trivially perfect

Daniel Bayer; Van Bang Le; H. N. de Ridder

2009-11-01T23:59:59.000Z

163

Agricultural Microscopy Division Of Interest  

Science Conference Proceedings (OSTI)

Agricultural Microscopy, Reports, Journals, Websites Agricultural Microscopy Division Of Interest Agricultural Microscopy agri-food sector agricultural Agricultural Microscopy analytical aocs articles biotechnology courses detergents division divisions f

164

Hydrogen adsorption on Ru(001) studied by Scanning Tunneling Microscopy  

E-Print Network (OSTI)

R.B. Anderson, The Fisher-Tropsch and Related Syntheses,for example in Fisher-Tropsch and Ammonia Synthesis

Tatarkhanov, Mous; Rose, Franck; Fomin, Evgeny; Ogletree, D. Frank; Salmeron, Miquel

2008-01-01T23:59:59.000Z

165

Nonlinear Laser Scanning Microscopy of Pathological Vocal Fold ...  

Science Conference Proceedings (OSTI)

Pilot work from banked tissue biopsies from patients will be presented. ... Photoemission Study of Zircaloy-4 Oxides Structure via Synchrotron Radiation.

166

Using Scanning Acoustic Microscopy to Study Subsurface Defects ...  

Science Conference Proceedings (OSTI)

The resolution of the reflection acoustic microscope is somewhat better than the resolution based on the Rayleigh criterion and is given by the equation6: ...

167

NIST: Ultraviolet Photoemission Electron Microscopy  

Science Conference Proceedings (OSTI)

Ultraviolet Photoemission Electron Microscopy. Summary: Ultraviolet photoemission electron microscopy is used to study ...

2012-11-19T23:59:59.000Z

168

Agricultural Microscopy Division  

Science Conference Proceedings (OSTI)

The Agricultural Microscopy Division advances visual imaging in discerning the quality and content of ingredients and finished products of the feed, fertilizer, seed, and agri-food sectors. Agricultural Microscopy Division Divisions achievement ag

169

Metrology Electron Microscopy  

Science Conference Proceedings (OSTI)

Metrology Electron Microscopy. Technical Contact: Joseph (Joe) Fu. 301-975-3795. Figure 1. SRM 484f Sample and its Micrograph. ...

2011-10-28T23:59:59.000Z

170

BNL | CFN: Electron Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

and chemistry at the atomic scale is crucial to modern materials science and nanotechnology. Advanced electron microscopy can provide the fundamental knowledge that will...

171

Development of Micromachined Probes for Bio-Nano Applications  

E-Print Network (OSTI)

The most commonly known macro scale probing devices are simply comprised of metallic leads used for measuring electrical signals. On the other hand, micromachined probing devices are realized using microfabrication techniques and are capable of providing very fine, micro/nano scale interaction with matter; along with a broad range of applications made possible by incorporating MEMS sensing and actuation techniques. Micromachined probes consist of a well-defined tip structure that determines the interaction space, and a transduction mechanism that could be used for sensing a change, imparting external stimuli or manipulating matter. Several micromachined probes intended for biological and nanotechnology applications were fabricated, characterized and tested. Probes were developed under two major categories. The first category consists of Micro Electromagnetic Probes for biological applications such as single cell, particle, droplet manipulation and neuron stimulation applications; whereas the second category targets novel Scanning Probe topologies suitable for direct nanopatterning, variable resolution scanning probe/dip-pen nanolithography, and biomechanics applications. The functionality and versatility of micromachined probes for a broad range of micro and nanotechnology applications is successfully demonstrated throughout the five different probes/applications that were studied. It is believed that, the unique advantages of precise positioning capability, confinement of interaction as determined by the probe tip geometry, and special sensor/actuator mechanisms incorporated through MEMS technologies will render micromachined probes as indispensable tools for microsystems and nanotechnology studies.

Yapici, Murat K.

2009-08-01T23:59:59.000Z

172

Scanning probe characterization of novel semiconductor materials and devices  

E-Print Network (OSTI)

V. Smith, E. T. Yu, J. M. Redwing, and K. S. Boutros, Appl.V. Smith, E. T. Yu, J. M. Redwing, and K. S. Boutros, Appl.Dang, E. T. Yu, and J. M. Redwing, J. Vac. Sci. Technol. B

Zhou, Xiaotian

2007-01-01T23:59:59.000Z

173

Scanning Probe Techniques for Functional Materials: Optical Near ...  

Science Conference Proceedings (OSTI)

Antenna-enhanced Optoelectronics of Carbon Nanotubes: Achim Hartschuh1 ... Single-walled carbon nanotubes are remarkable quasi-1D materials that can be  ...

174

Acoustic Microscopy Applications*  

Science Conference Proceedings (OSTI)

Figure: ...Fig. 17 A portion of the 160 mm 2 (0.25 in. 2 ) area of an alumina ceramic disk scanned by an acoustic microscope

175

Novel Microscopy Techniques  

Science Conference Proceedings (OSTI)

Oct 19, 2011 ... Atomic Imaging of Surface and Bulk with an Aberration Corrected Scanning Electron Microscope: Yimei Zhu1; 1Brookhaven National ...

176

Analytical scanning evanescent microwave microscope and control stage  

DOE Patents (OSTI)

A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

2013-01-22T23:59:59.000Z

177

Analytical scanning evanescent microwave microscope and control stage  

DOE Patents (OSTI)

A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

Xiang, Xiao-Dong (Danville, CA); Gao, Chen (Anhui, CN); Duewer, Fred (Albany, CA); Yang, Hai Tao (Albany, CA); Lu, Yalin (Chelmsford, MA)

2009-06-23T23:59:59.000Z

178

Transmission Electron Microscopy (TEM)  

Science Conference Proceedings (OSTI)

...Transmission electron microcopy (TEM) has been used since the 1950s to obtain very high resolution images of microstructures. As TEMs were enhanced to include features such as digitally scanned point beams and energy dispersive x-ray detectors

179

Nonlinear vibrational microscopy  

SciTech Connect

The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. Microscopic imaging with a vibrational spectroscopic contrast is achieved by generating signals in a nonlinear optical process and spatially resolved detection of the signals. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a. directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b. collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c. removing the residual beam; and d. detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution then IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers. CARS and SFG microscopy does not rely on the presence of fluorophores, but retains the resolution and three-dimensional sectioning capability of confocal and two-photon fluorescence microscopy. Complementary to these techniques, CARS and SFG microscopy provides a contrast mechanism based on vibrational spectroscopy. This vibrational contrast mechanism, combined with an unprecedented high sensitivity at a tolerable laser power level, provides a new approach for microscopic investigations of chemical and biological samples.

Holtom, Gary R. (Richland, WA); Xie, Xiaoliang Sunney (Richland, WA); Zumbusch, Andreas (Munchen, DE)

2000-01-01T23:59:59.000Z

180

Indentation of a Punch with Chemical or Heat Distribution at Its Base into Transversely Isotropic Half-Space: Application to Local Thermal and Electrochemical Probes  

SciTech Connect

The exact solution to the coupled problem of indentation of the punch, subjected to either heat or chemical substance distribution at its base, into three-dimensional semi-infinite transversely isotropic material is presented. The entire set of field components are derived in terms of integrals of elementary functions using methods of the potential theory and recently obtained, by the authors, results for the general solution of the field equations in terms of four harmonic potential functions. The exact solution for the stiffness relations that relate applied force, total chemical diffusion/heat flux in the domain of the contact, with indenter displacement, temperature, or chemical substance distribution of diffusing species at the base, and materials' chemo/thermo-elastic properties are obtained in closed form and in terms of elementary functions. These results can be used to understand the image formation mechanisms in techniques such as thermal scanning probe microscopy and electrochemical strain microscopy

Karapetian, E. [Suffolk University, Boston; Kalinin, Sergei V [ORNL

2013-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


181

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

SAMM SAMM EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Sub-Ă…ngstrom Microscopy and Microanalysis Facility In order to meet the scientific challenges of the future, the EMC has built a new state-of-the-art laboratory space for advanced electron microscopy. The new building has been designed to provide next- generation science with an operating environment that cannot be attained by renovating existing facilities. The EMC staff learned as much as possible from similar efforts around the world, including the SuperSTEM building at Daresbury, the Triebenberg Special Laboratory, the AML at Oak Ridge National Laboratory, the new NIST building, and various facilities for nanoscience.

182

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Acknowledgment Acknowledgment EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Acknowledgment Please acknowledge your use of the EMC in your publications and presentations with the following acknowledgment statement: The electron microscopy was accomplished at the Electron Microscopy Center at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC.

183

Nano-scale optical and electrical probes of materials and processes.  

DOE Green Energy (OSTI)

This report describes the investigations and milestones of the Nano-Scale Optical and Electrical Probes of Materials and Processes Junior/Senior LDRD. The goal of this LDRD was to improve our understanding of radiative and non-radiative mechanisms at the nanometer scale with the aim of increasing LED and solar cell efficiencies. These non-radiative mechanisms were investigated using a unique combination of optical and scanning-probe microscopy methods for surface, materials, and device evaluation. For this research we utilized our new near-field scanning optical microscope (NSOM) system to aid in understanding of defect-related emission issues for GaN-based materials. We observed micrometer-scale variations in photoluminescence (PL) intensity for GaN films grown on Cantilever Epitaxy pattern substrates, with lower PL intensity observed in regions with higher dislocation densities. By adding electrical probes to the NSOM system, the photocurrent and surface morphology could be measured concurrently. Using this capability we observed reduced emission in InGaN MQW LEDs near hillock-shaped material defects. In spatially- and spectrally-resolved PL studies, the emission intensity and measured wavelength varied across the wafer, suggesting the possibility of indium segregation within the InGaN quantum wells. Blue-shifting of the InGaN MQW wavelength due to thinning of quantum wells was also observed on top of large-scale ({micro}m) defect structures in GaN. As a direct result of this program, we have expanded the awareness of our new NSOM/multifunctional SPM capability at Sandia and formed several collaborations within Sandia and with NINE Universities. Possible future investigations with these new collaborators might include GaN-based compound semiconductors for green LEDs, nanoscale materials science, and nanostructures, novel application of polymers for OLEDs, and phase imprint lithography for large area 3D nanostructures.

Bogart, Katherine Huderle Andersen

2007-03-01T23:59:59.000Z

184

Regular Scanning Tunneling Microscope Tips can be Intrinsically Chiral  

Science Conference Proceedings (OSTI)

We report our discovery that regular scanning tunneling microscope tips can themselves be chiral. This chirality leads to differences in electron tunneling efficiencies through left- and right-handed molecules, and, when using the tip to electrically excite molecular rotation, large differences in rotation rate were observed which correlated with molecular chirality. As scanning tunneling microscopy is a widely used technique, this result may have unforeseen consequences for the measurement of asymmetric surface phenomena in a variety of important fields.

Tierney, Heather L.; Murphy, Colin J.; Sykes, E. Charles H. [Department of Chemistry, Tufts University, Medford, Massachusetts 02155-5813 (United States)

2011-01-07T23:59:59.000Z

185

cell probe model  

Science Conference Proceedings (OSTI)

NIST. cell probe model. (definition). Definition: A model of computation where the cost of a computation is measured by the ...

2013-05-08T23:59:59.000Z

186

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites

Laboratory Laboratory Electron Microscopy Center Argonne Home > EMC > EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

187

Agricultural Microscopy Division List  

Science Conference Proceedings (OSTI)

Name AffiliationCity, State, CountryAgricultural Microscopy Division2013 Members72 Members as of October 1, 2013Ajbani, RutviInstitute of Chemical TechnologyMumbai, MH, IndiaAlonso, CarmenPuerto Rico Dept ofAgricultureDorado, Puerto RicoArmbrust, KevinLoui

188

Vector generator scan converter  

DOE Patents (OSTI)

High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O (input/output) channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardward for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold.

Moore, James M. (Livermore, CA); Leighton, James F. (Livermore, CA)

1990-01-01T23:59:59.000Z

189

Vector generator scan converter  

DOE Patents (OSTI)

High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardware for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold. 7 figs.

Moore, J.M.; Leighton, J.F.

1988-02-05T23:59:59.000Z

190

Scanning computed confocal imager  

DOE Patents (OSTI)

There is provided a confocal imager comprising a light source emitting a light, with a light modulator in optical communication with the light source for varying the spatial and temporal pattern of the light. A beam splitter receives the scanned light and direct the scanned light onto a target and pass light reflected from the target to a video capturing device for receiving the reflected light and transferring a digital image of the reflected light to a computer for creating a virtual aperture and outputting the digital image. In a transmissive mode of operation the invention omits the beam splitter means and captures light passed through the target.

George, John S. (Los Alamos, NM)

2000-03-14T23:59:59.000Z

191

NIST Manuscript Publication Search  

Science Conference Proceedings (OSTI)

... Scanning Probe Microscopy for Energy Research. ... World Scientific Publishing Company, Hackensack, NJ. ... Atomic force microscopy (AFM), Solar. ...

2013-05-27T23:59:59.000Z

192

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

An Office of Science User Facility An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

193

Electron Microscopy Lab  

NLE Websites -- All DOE Office Websites (Extended Search)

Facilities » Facilities » Electron Microscopy Lab Electron Microscopy Lab Focusing on the study of microstructures with electron and ion beam instruments, including crystallographic and chemical techniques. April 12, 2012 Transmission electron microscope Rob Dickerson examines a multiphase oxide scale using the FEI Titan 80-300 transmission electron microscope. Contact Rob Dickerson (505) 667-6337 Email Rod McCabe (505) 606-1649 Email Pat Dickerson (505) 665-3036 Email Tom Wynn (505) 665-6861 Email Dedicated to the characterization of materials through imaging, chemical, and crystallographic analyses of material microstructures in support of Basic Energy Science, Laboratory Directed Research and Development, DoD, DOE, Work for Others, nuclear energy, and weapons programs. Go to full website »

194

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Training Training EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers User Training Prior Training in Electron Microscopy: People who wish to operate TEMs must have at least one college-level course in TEM with a lab component or previous TEM experience. The college course can't be one in which TEM was just one of many topics. For researchers who lack academic training and/or practical experience in electron microscopy, we suggest the short courses in TEM at the Hooke College of Applied Sciences, and the hands-on TEM courses at Northwestern University or the University of Chicago or Northern Illinois University.

195

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Overview Overview The mission of the Electron Microscopy Center (EMC) is to: Conduct materials research using advanced microstructural characterization methods; Maintain unique resources and facilities for scientific research for the both the Argonne National Laboratory and national scientific community. Develop and expand the frontiers of microanalysis by fostering the evolution of synergistic state-of-the-art resources in instrumentation, techniques and scientific expertise; The staff members of the EMC carry out their own research as well as participate in collaborative programs with other scientists at Argonne National Laboratory as well as researchers, educators and students worldwide. The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff perform collaborative research with members of other Divisions at Argonne National Laboratory and with collaborators from universities and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

196

Only critical information was scanned  

Office of Legacy Management (LM)

Only critical information was scanned. Entire document is available upon request - Click here to email a...

197

Scanning micro-sclerometer  

DOE Patents (OSTI)

A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch.

Oliver, Warren C. (Knoxville, TN); Blau, Peter J. (Oak Ridge, TN)

1994-01-01T23:59:59.000Z

198

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Laboratory, MST-6 Electron Microscopy Laboratory, MST-6 MST-6 Home Home In the MSL FEI Tecnai F30 Analytical TEM/STEM JEOL 6300FXV High Resolution SEM JEOL 3000F High Resolution Transmission Electron Microscope Philips XL30 F Scanning Electron Microscope & Orientation Imaging System Phillips CM30 Transmission Electron Microscope In the Sigma Building JEOL 840 EPMA with Wavelength Dispersive Spectroscopy FEI Strata DB235 FIB/SEM FEI XL30 Environmental Scanning Electron Microscope & Orientation Imaging System CONTACTS Bob Field 665.3938 Pat Dickerson 665.3036 Rob Dickerson 667.6337 Rod McCabe 606.1649 The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory (EML) is part of MST-6, the Materials Technology - Metallurgy Group within the Materials Science and Technology Division at Los Alamos National Laboratory. It is a facility dedicated to the characterization of materials primarily through imaging, chemical, and crystallographic analyses of material microstructures with several electron and ion beam instruments. Accessory characterization techniques and equipment include energy dispersive x-ray analysis (EDS), wavelength dispersive x-ray analysis (WDS), electron backscatter diffraction (EBSD) and orientation imaging microscopy (OIM), and electron energy loss spectroscopy (EELS).

199

Agricultural Microscopy Newsletter March 11  

Science Conference Proceedings (OSTI)

AOCS Agricultural Microscopy Division Newsletter March 2011 Greetings from the Chairperson The Agricultural Microscopy Division would like to take this opportunity to express our sincere sympathy to the family and friends of George Liepa who rece

200

Advanced Developments in Electron Microscopy  

Science Conference Proceedings (OSTI)

About this Symposium. Meeting, Materials Science & Technology 2011. Symposium, Advanced Developments in Electron Microscopy. Sponsorship, MS&T ...

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


201

APS/123-QED Understanding the atomic-scale contrast in Kelvin Probe Force  

E-Print Network (OSTI)

APS/123-QED Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy Laurent Nony 1 are crucial to understand the atomic-scale KPFM signal. The calculations of the force #12;eld were performed

Recanati, Catherine

202

Argonne CNM: X-Ray Microscopy Capabilities  

NLE Websites -- All DOE Office Websites (Extended Search)

X-Ray Microscopy Facilities X-Ray Microscopy Facilities The Hard X-Ray Nanoprobe (HXN) facility provides scanning fluorescence, scanning diffraction, and full-field transmission and tomographic imaging capabilities with a spatial resolution of 30 nm over a spectral range of 6-12 keV. Modes of Operation Full-Field Transmission Imaging and Nanotomography X-ray transmission imaging uses both the absorption and phase shift of the X-ray beam by the sample as contrast mechanisms. Absorption contrast is used to map the sample density. Elemental constituents can be located by using differential edge contrast in this mode. Phase contrast can be highly sensitive to edges and interfaces even when the X-ray absorption is weak. These contrast mechanisms are exploited to image samples rapidly in full-field transmission mode under various environmental conditions, or combined with nanotomography methods to study the three-dimensional structure of complex and amorphous nanomaterials with the HXN.

203

An Algebra of Scans  

E-Print Network (OSTI)

A parallel prefix circuit takes n inputs x1 , x2 , . . . , xn and produces the n outputs x1 , x1 x2 , . . . , x1 x2 xn , where `#' is an arbitrary associative binary operation. Parallel prefix circuits and their counterparts in software, parallel prefix computations or scans, have numerous applications ranging from fast integer addition over parallel sorting to convex hull problems. A parallel prefix circuit can be implemented in a variety of ways taking into account constraints on size, depth, or fanout. Traditionally, implementations are either defined graphically or by enumerating the underlying graph. Both approaches have their pros and cons. A figure if well drawn conveys the possibly recursive structure of the scan but it is not amenable to formal manipulation. A description in form of a graph while rigorous obscures the structure of a scan and is equally hard to manipulate. In this paper we show that parallel prefix circuits enjoy a very pleasant algebra. Using only two basic building blocks and four combinators all standard designs can be described succinctly and rigorously. The rules of the algebra allow us to prove the circuits correct and to derive circuit designs in a systematic manner. lord darlington. . . . [Sees a fan lying on the table.] And what a wonderful fan! May I look at it? lady windermere. Do. Pretty, isn't it! It's got my name on it, and everything. I have only just seen it myself. It's my husband's birthday present to me. You know to-day is my birthday? --- Oscar Wilde, Lady Windermere's Fan 1

Ralf Hinze

2004-01-01T23:59:59.000Z

204

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

CM30T TEM CM30T TEM Instrument capabilities: Instrument specifications: Accelerating voltages: 100-300 kV LaB6 emitter Resolution (at 300 kV): ~ 0.25 nm point; ~ 0.14 nm line Minimum probe size: ~ 9 nm Operating modes: CTEM, CBED, SAED, light element XEDS CCD camera: 1 Mp, 14 bits, AVI capture possible at 15 fps Specimen holders: Double Tilt (+/- 60 degrees alpha, +/- 30 degrees beta): with Be cup for XEDS liquid nitrogen cooled (96 K) with Be cup heating (1270 K) Tilt/rotate (+/- 60 degrees alpha, rotation 360 degrees) Single Tilt (+/- 60 degrees alpha) Typical experiments (examples): Quantitative XEDS Morphological and diffraction contrast studies of defects In situ heating & cooling studies Electron crystallography Weak beam studies of defects This page can be downloaded here as an Adobe PDF file.

205

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

iTEAM iTEAM The in situ Transmission Electron Aberration Corrected Microscope (iTEAM) is a proposed project to develop a microscope with powerful capabilities for in situ studies of materials in their native environment. iTEAM will build on the success of the TEAM project by utilizing both spherical and chromatic aberration correction in an electron microscope to provide unprecedented capabilities to study materials in controlled environments of temperature, pressure, or fluidic states with the high-resolution in imaging, diffraction, and spectroscopy typical of electron probes. The capabilities of iTEAM will lead to new ways to understand the behavior of materials in native environments, with particular relevance to major energy initiatives such as catalysis, solar conversion, fuel cells, and batteries. In addition, iTEAM will provide new capabilities to understand organic/inorganic interfaces, functionalized nanoparticles, and biomaterials under natural conditions.

206

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

FEI Tecnai F20ST TEM/STEM FEI Tecnai F20ST TEM/STEM Instrument capabilities: Instrument specifications: Accelerating voltages: 80-200 kV Schottky FEG emitter Resolution (at 200 kV): ~0.24 nm point; ~0.1 nm line; probe size ~0.2-1 nm Operating modes: CTEM, STEM (BF/ADF, HAADF), CBED, SAED, light element XEDS, EELS, spectrum imaging, energy-filtered imaging (EFI), Lorentz magnetic imaging (LMI), electron holographic imaging (EHI), other computationally-mediated modes. On-axis CCD camera: 16 Mp, 16 bits, 61x61 mm chip size. EMC-owned specimen holders: Double Tilt (+/- 40 degrees alpha, +/- 30 degrees beta): with Be cup for XEDS liquid nitrogen cooled (96 K) with Be cup heating (1270 K) In-plane magnetic field (tilt +/- 40 degrees alpha) Liquid He cooled (tilt +/- 40 degrees alpha, rotate 360 degrees)

207

How HCI interprets the probes  

Science Conference Proceedings (OSTI)

We trace how cultural probes have been adopted and adapted by the HCI community. The flexibility of probes has been central to their uptake, resulting in a proliferation of divergent uses and derivatives. The varying patterns of adaptation of the probes ... Keywords: cultural probes, probes, reflective HCI

Kirsten Boehner; Janet Vertesi; Phoebe Sengers; Paul Dourish

2007-04-01T23:59:59.000Z

208

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Becoming a User Becoming a User EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Procedure to Become a User at the EMC 1. Summary All users have to fulfill certain requirements before access to the EMC can be granted. The following list provides short descriptions of the requirements. Details can be found on this page and via the relevant links at the left. Register for access to Argonne's scientific user facilities (or update your user registration information).

209

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Submit an EMC Proposal Submit an EMC Proposal EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Submit an EMC Proposal EMC Proposal Submission Deadline Dates for FY2014: November 1, 2013 March 7, 2014 July 11, 2014 Is your proposal a multi-facility proposal? In other words, do you intend to submit proposals to EMC and APS or CNM for your research project? If your answer is "yes," go now to the Proposal Gateway.

210

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

EMC Users Committee EMC Users Committee EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers EMC Users Committee An EMC Users Committee has been organized to enhance communication between the user community and the EMC. While the EMC relies on and encourages strong interaction among its users and between its staff and users, the Users Committee provides an additional formal mechanism for user input into EMC planning and operations to ensure that users' needs and concerns are addressed.

211

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

End-of-Proposal Report End-of-Proposal Report EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers End-of-Proposal Report In accordance with the User Agreement, please provide the EMC with the following information when your proposal expires (one year after its acceptance date or when the experiments end, whichever is sooner). A research summary/progress report using these two templates:

212

Scanning Confocal Electron Microscope (SCEM)  

Transmission/Scanning Transmission Electron Microscope. The SCEM enables imaging of sub-surface structures of thick, optically opaque materials, ...

213

Timing-Driven Partial Scan  

Science Conference Proceedings (OSTI)

We present a partial scan approach, which aims at reducing both area overhead and performance degradation caused by test logic. Given a target speed and an initial design that meets the target, the algorithm selects a minimum set of scan flip-flops, ... Keywords: Test algorithms, partial scan, test synthesis, design for test

Jing-yang Jou; Kwang-ting (tim) Cheng

1995-12-01T23:59:59.000Z

214

Agricultural Microscopy Division Newsletter September 2013  

Science Conference Proceedings (OSTI)

Read the latest news from the Agricultural Microscopy division. Agricultural Microscopy Division Newsletter September 2013 Agricultural Microscopy Division Newsletter September 2013 ...

215

NCEM National Center for Electron Microscopy: Links  

NLE Websites -- All DOE Office Websites (Extended Search)

National Laboratory, Center for Materials Research Brookhaven National Laboratory, Electron Microscopy Program Sites of Interest to the Microscopy Community The Microscopy...

216

BEAM CONTROL PROBE  

DOE Patents (OSTI)

A probe is described for intercepting a desired portion of a beam of charged particles and for indicating the spatial disposition of the beam. The disclosed probe assembly includes a pair of pivotally mounted vanes moveable into a single plane with adjacent edges joining and a calibrated mechanical arrangement for pivoting the vancs apart. When the probe is disposed in the path of a charged particle beam, the vanes may be adjusted according to the beam current received in each vane to ascertain the dimension of the beam.

Chesterman, A.W.

1959-03-17T23:59:59.000Z

217

Chemical sensing flow probe  

DOE Patents (OSTI)

A new chemical probe determines the properties of an analyte using the light absorption of the products of a reagent/analyte reaction. The probe places a small reaction volume in contact with a large analyte volume. Analyte diffuses into the reaction volume. Reagent is selectively supplied to the reaction volume. The light absorption of the reaction in the reaction volume indicates properties of the original analyte. The probe is suitable for repeated use in remote or hostile environments. It does not require physical sampling of the analyte or result in significant regent contamination of the analyte reservoir.

Laguna, George R. (Albuquerque, NM); Peter, Frank J. (Albuquerque, NM); Butler, Michael A. (Albuquerque, NM)

1999-01-01T23:59:59.000Z

218

Chemical sensing flow probe  

DOE Patents (OSTI)

A new chemical probe determines the properties of an analyte using the light absorption of the products of a reagent/analyte reaction. The probe places a small reaction volume in contact with a large analyte volume. Analyte diffuses into the reaction volume. Reagent is selectively supplied to the reaction volume. The light absorption of the reaction in the reaction volume indicates properties of the original analyte. The probe is suitable for repeated use in remote or hostile environments. It does not require physical sampling of the analyte or result in significant regent contamination of the analyte reservoir. 7 figs.

Laguna, G.R.; Peter, F.J.; Butler, M.A.

1999-02-16T23:59:59.000Z

219

Directional histogram ratio at random probes: A local thresholding criterion for capillary images  

Science Conference Proceedings (OSTI)

With the development of micron-scale imaging techniques, capillaries can be conveniently visualized using methods such as two-photon and whole mount microscopy. However, the presence of background staining, leaky vessels and the diffusion of small fluorescent ... Keywords: Capillary, Directional histogram ratio, Image thresholding, Random probe, Two-photon imaging, Whole mount microscopy

Na Lu; Jharon Silva; Yu Gu; Scott Gerber; Hulin Wu; Harris Gelbard; Stephen Dewhurst; Hongyu Miao

2013-07-01T23:59:59.000Z

220

Carbon nanotube based electromechanical probes  

E-Print Network (OSTI)

Electromechanical probing applications continuously require smaller pitches, faster manufacturing and lower electrical resistance. Conventional techniques, such as MEMS based cantilever probes have their shortcomings in ...

Yaglioglu, Onnik, 1976-

2007-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


221

OBSERVATIONAL SCAN-INDUCED ARTIFICIAL COSMIC MICROWAVE BACKGROUND ANISOTROPY  

SciTech Connect

Reliably detecting the cosmic microwave background (CMB) anisotropy is of great importance in understanding the birth and evolution of the universe. One of the difficulties in CMB experiments is the domination of measured CMB anisotropy maps by the Doppler dipole moment from the motion of the antenna relative to the CMB. For each measured temperature, the expected dipole component has to be calculated separately and then subtracted from the data. A small error in dipole direction, antenna pointing direction, sidelobe pickup contamination, and/or timing synchronism can introduce a significant deviation in the dipole-cleaned CMB temperature. After a full-sky observational scan, the accumulated deviations will be structured with a pattern closely correlated with the observation pattern with artificial anisotropies, including artificial quadrupole, octupole, etc., on large scales in the final CMB map. Such scan-induced anisotropies on large scales can be predicted by the true dipole moment and observational scan scheme. Indeed, the expected scan-induced quadrupole pattern of the Wilkinson Microwave Anisotropy Probe (WMAP) mission is perfectly in agreement with the published WMAP quadrupole. With the scan strategy of the Planck mission, we predict that scan-induced anisotropies will also produce an artificially aligned quadrupole. The scan-induced anisotropy is a common problem for all sweep missions and, like the foreground emissions, has to be removed from observed maps. Without doing so, CMB maps from COBE, WMAP, and Planck are not reliable for studying the CMB anisotropy.

Liu Hao; Li Tipei, E-mail: liuhao@ihep.ac.cn, E-mail: litp@tsinghua.edu.cn [Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing (China)

2011-05-10T23:59:59.000Z

222

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

General Information for EMC Users General Information for EMC Users The Electron Microscopy Center (EMC) is an Office of Science User Facility operated for the U.S. Department of Energy Office of Science by Argonne National Laboratory. It is one of three scientific user facilities for electron beam microcharacterization and one of several National User Facilities located at Argonne National Laboratory. As a scientific user facility, the EMC supports user-accessible instruments (Resources) for high spatial resolution microanalysis, field imaging, nanoscale structural characterization, nanoscale fabrication and manipulation, and unique in situ studies of materials under the influence of ion-beam irradiation. These capabilities are used in a diverse variety of research areas to address grand challenge scientific questions encompassing, for example, energy-related studies, biology, astrophysics, archaeology, superconductivity, nanotechnology, environmental engineering, tribology, and ferroelectricity. The research is performed both by users and by EMC staff. While many users work independently, the most challenging research activities require extensive contributions from EMC staff.

223

Hard probes 2006 Asilomar  

E-Print Network (OSTI)

"The second international conference on hard and electromagnetic probes of high-energy nuclear collisions was held June 9 to 16, 2006 at the Asilomar Conference grounds in Pacific Grove, California" (photo and 1/2 page)

2006-01-01T23:59:59.000Z

224

Convective heat flow probe  

DOE Patents (OSTI)

A convective heat flow probe device is provided which measures heat flow and fluid flow magnitude in the formation surrounding a borehole. The probe comprises an elongate housing adapted to be lowered down into the borehole; a plurality of heaters extending along the probe for heating the formation surrounding the borehole; a plurality of temperature sensors arranged around the periphery of the probe for measuring the temperature of the surrounding formation after heating thereof by the heater elements. The temperature sensors and heater elements are mounted in a plurality of separate heater pads which are supported by the housing and which are adapted to be radially expanded into firm engagement with the walls of the borehole. The heat supplied by the heater elements and the temperatures measured by the temperature sensors are monitored and used in providing the desired measurements. The outer peripheral surfaces of the heater pads are configured as segments of a cylinder and form a full cylinder when taken together. A plurality of temperature sensors are located on each pad so as to extend along the length and across the width thereof, with a heating element being located in each pad beneath the temperature sensors. An expansion mechanism driven by a clamping motor provides expansion and retraction of the heater pads and expandable packet-type seals are provided along the probe above and below the heater pads.

Dunn, J.C.; Hardee, H.C.; Striker, R.P.

1984-01-09T23:59:59.000Z

225

Materials Applications of Photoelectron Emission Microscopy  

SciTech Connect

Photoelectron emission microscopy (PEEM) is a versatile technique that can image a variety of materials including metals, semiconductors and even insulators. Under favorable conditions the most advanced aberration corrected instruments have a spatial resolution approaching 2 nm. Although PEEM cannot compete with transmission or scanning electron microscopies for ultimate resolution, the technique is much more gentle and has the unique advantage of imaging structure as well as electronic and magnetic states on the nanoscale. Since the image contrast is derived from spatial variations in electron photoemission intensity, PEEM is ideal for interrogating both static and dynamic electronic properties of complex nanostructured materials. PEEM can be performed using a variety of photoexcitation sources including synchrotron emission, femtosecond laser pulses and conventional UV lamp emission. Each source has advantages, for example, fs laser excitation enables time-resolved imaging for study of ultrafast dynamics of surface intermediate states while tunable synchrotron sources allow chemically specific excitation. Even more detail can be extracted from energy resolved PEEM. Here, we review the key principles and contrast mechanisms of PEEM and briefly summarize materials applications of PEEM with examples of a thermally-induced structural phase transformation in barium titanate, inter-diffusion between thin metal copper and ruthenium layers, and multiphoton imaging of polystyrene nanoparticles on a silver coated substrate.

Xiong, Gang; Shao, Rui; Peppernick, Samuel J.; Joly, Alan G.; Beck, Kenneth M.; Hess, Wayne P.; Cai, Mingdong; Duchene, J.; Wang, J. Y.; Wei, Wei

2010-12-30T23:59:59.000Z

226

Ultrasonic search wheel probe  

DOE Patents (OSTI)

A device is provided for reducing internal reflections from the tire of an ultrasonic search wheel probe or from within the material being examined. The device includes a liner with an anechoic chamber within which is an ultrasonic transducer. The liner is positioned within the wheel and includes an aperture through which the ultrasonic sound from the transducer is directed.

Mikesell, Charles R. (Idaho Falls, ID)

1978-01-01T23:59:59.000Z

227

Feed Microscopy Laboratory Proficiency Testing Program  

Science Conference Proceedings (OSTI)

Lab Proficiency Testing service for Feed Microscopy using microscopic examination of animal feed samples and AAFCO terminology. Feed Microscopy Laboratory Proficiency Testing Program Agricultural Microscopy agri-food sector agricultural Agricultural Micr

228

Scanning/Transmission Electron Microscopes  

NLE Websites -- All DOE Office Websites (Extended Search)

ScanningTransmission Electron Microscopes Nion UltraSTEM 60-100 dedicated aberration-corrected STEM for low- to mid-voltage operation and Enfina EELS Contact: Juan-Carlos Idrobo,...

229

Transverse section radionuclide scanning system  

DOE Patents (OSTI)

This invention provides a transverse section radionuclide scanning system for high-sensitivity quantification of brain radioactivity in cross-section picture format in order to permit accurate assessment of regional brain function localized in three-dimensions. High sensitivity crucially depends on overcoming the heretofore known raster type scanning, which requires back and forth detector movement involving dead-time or partial enclosure of the scan field. Accordingly, this invention provides a detector array having no back and forth movement by interlaced detectors that enclose the scan field and rotate as an integral unit around one axis of rotation in a slip ring that continuously transmits the detector data by means of laser emitting diodes, with the advantages that increased amounts of data can be continuously collected, processed and displayed with increased sensitivity according to a suitable computer program.

Kuhl, David E. (Rosemont, PA); Edwards, Roy Q. (Plymouth Township, PA)

1976-01-01T23:59:59.000Z

230

Exploring nanomagnetism with soft x-ray microscopy  

SciTech Connect

Magnetic soft X-ray microscopy images magnetism in nanoscale systems with a spatial resolution down to 15nm provided by state-of-the-art Fresnel zone plate optics. X-ray magnetic circular dichroism (X-MCD) is used as element-specific magnetic contrast mechanism similar to photoemission electron microscopy (PEEM), however, with volume sensitivity and the ability to record the images in varying applied magnetic fields which allows to study magnetization reversal processes at fundamental length scales. Utilizing a stroboscopic pump-probe scheme one can investigate fast spin dynamics with a time resolution down to 70 ps which gives access to precessional and relaxation phenomena as well as spin torque driven domain wall dynamics in nanoscale systems. Current developments in zone plate optics aim for a spatial resolution towards 10nm and at next generation X-ray sources a time resolution in the fsec regime can be envisioned.

Fischer, P.; Kim, D.-H.; Mesler, B.L.; Chao, W.; Sakdinawat,A.E.; Anderson, E.H.

2006-10-30T23:59:59.000Z

231

Electron microscopy of ceramic superconductors  

SciTech Connect

The critical current Jc is at least as important as Tc (transition temperature) for applications in superconducting materials. Jc is strongly dependent on microstructure and, in consequence, electron microscopy will continue to be important in the development of practical ceramic superconductors. We will review the progress that has been made over the past year or so in studying the superconductors by electron microscopy techniques of all kinds--conventional, high resolution, analytical, etc. A thorough review is impossible but a bibliography is available, as well as two special issues of Journals. 25 refs., 9 figs.

Mitchell, T.E.; Roy, T.

1988-01-01T23:59:59.000Z

232

Design of a scanning gate microscope in a cryogen-free dilution refrigerator  

E-Print Network (OSTI)

We report on our design of a scanning gate microscope housed in a cryogen-free dilution refrigerator with a base temperature of 15 mK. The recent increase in efficiency of pulse tube cryocoolers has made cryogen-free systems popular in recent years. However, this new style of cryostat presents challenges for performing scanning probe measurements, mainly as a result of the vibrations introduced by the cryocooler. We demonstrate scanning with root-mean-square vibrations of 0.8 nm at 3 K and 2.1 nm at 15 mK in a 1 kHz bandwidth with our design.

Pelliccione, Matthew; Bartel, John; Keller, Andrew; Goldhaber-Gordon, David

2012-01-01T23:59:59.000Z

233

Electron Microscopy of Carbon Nanotube Composites  

Science Conference Proceedings (OSTI)

Electron Microscopy of Carbon Nanotube Composites. Summary: Carbon nanomaterials such as carbon nanotubes (CNTs ...

2013-07-01T23:59:59.000Z

234

Microscopy for STEM Educators - SPIE Conference 2012  

Science Conference Proceedings (OSTI)

SPIE Conference 2012. SPIE Conference 2012. ... Microscopy for STEM Educators - SPIE Conference 2012. Sound interesting? ...

2012-05-09T23:59:59.000Z

235

Analytical electron microscopy characterization of uranium-contaminated soils from the Fernald Site, FY1993 report  

SciTech Connect

A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM) is being used to determine the nature of uranium in soils from the Fernald Environmental Management Project. The information gained from these studies is being used to develop and test remediation technologies. Investigations using SEM have shown that uranium is contained within particles that are typically 1 to 100 {mu}m in diameter. Further analysis with AEM has shown that these uranium-rich regions are made up of discrete uranium-bearing phases. The distribution of these uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Cunnane, J.C.; Brown, N.R.; Dietz, N.L.

1994-10-01T23:59:59.000Z

236

Structure and Reactions of Carbon and Hydrogen on Ru(0001): A Scanning Tunneling Microscopy Study  

E-Print Network (OSTI)

reactions, including Fischer-Tropsch synthesis, whereby coalcatalytic activity in Fischer-Tropsch synthesis, hydrocarbon

Shimizu, Tomoko K.

2009-01-01T23:59:59.000Z

237

HOGE DRUK SCANNING TUNNELING MICROSCOPIE VOOR KATALYTISCH ONDERZOEK: ONTWIKKELING EN PRESTATIES VAN DE "REACTOR-STM"  

E-Print Network (OSTI)

-y richting ongeveer 1 �/s. EERSTE METINGEN Als eerste modelsysteem hebben wij Fisher-Tropsch synthese op Co als industriële Fischer-Tropsch katalysator, met STM gasgeïnduceerde verruwing is waargenomen [1], en

Frenken, J.W.M.

238

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

et al. studied wood combustion and diesel combustionrange of deposited combustion products: creosote (wood smoke

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

239

Soft x-ray scanning transmission x-ray microscopy (STXM) of actinide particles  

E-Print Network (OSTI)

the Np(V,VI) solid. A plutonium elemental map was obtainedspectromicroscopy, plutonium, neptunium *Correspondingwell as for metallic plutonium. [19,20] A useful comparison

Nilsson, Hans J.; Tyliszczak, Tolek; Wilson, Richard E.; Werme, Lars; Shuh, David K.

2005-01-01T23:59:59.000Z

240

[Scanning tunnelling microscopy and spectroscopy of ceramic grain boundaries]. [Annual report, September 1992--September 1993  

SciTech Connect

Objective is to study the local geometric and electronic structure at grain boundaries in oxides; this was motivated by the potential to use STM and tunneling spectroscopy on semiconducting ceramics. In order to understand the imaging of low conductivity materials, a number of transition metal oxides were examined: ZnO, TiO{sub 2}. Spatial resolution limits are considered. Conductance profiles across silicon grain boundaries are compared with those across more complex SrTiO{sub 3} grain boundaries. Calculations of space charge in complex oxides are presented. A SEM/STM was constructed which operates in ultrahigh vacuum and has large scale positioning capability (> 1 cm).

Not Available

1993-10-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


241

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

Synchrotron Light Source, NSLS, (Brookhaven, USA) during thehave been at the ALS or NSLS. Several new instruments aremicroscopes at the ALS and NSLS are provided elsewhere. 18-

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

242

Nephila clavipes Spider Dragline Silk Microstructure Studied by Scanning Transmission X-ray Microscopy  

E-Print Network (OSTI)

). For a uniaxial system such as a fiber, the dichroic ratio image can then be used to calculate a map of the order structure or any periodicity along the fiber was observed at this spatial resolution. The surface of fresh by the spinning speed, STXM measurements clearly highlight microstructure differences. The slowpull fiber contains

Hitchcock, Adam P.

243

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

in secondary organic aerosol. Environ. Sci. Technol. 41 ,particles from an urban aerosol. Environ. Sci. Technol. 26 ,carbonaceous atmospheric aerosols. Journal of Aerosol

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

244

Scan  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

NAME OF PERSON WITH WHOM TO CONFER TELEPHONE DATE ARCHIVIST OF THE UNITED STATES Sharon Evelin NUMBER 1 301 -903-3455 i 1 - I REQUEST FOR REe?RDS DISPOSITION AUTHORITY NUMBER /dl- Y s + - o + - / TO: NATIONAL ARCH~VES & RECORDS ADMINISTRATION 8601 ADELPHI ROAD COLLEGE PARK, MD 20740-6001 1. FROM (Agency or establ~shment) U.S. DEPARTMENT OF ENERGY MAJOR SUBDIVISION Office of the Chief Information Officer MINOR SUBDIVISION Records Management Division I 1 8. DESCRIPTION OF ITEM AND PROPOSED DISPOSITION 1 9. GRS OR 1 10. A ~ T I O r Date received I Z L U V - ~ NOTIFICATION TO AGENCY In accordance with the provlslons of 44 U.S.C 3303a, the dlsposltlon request, Including amendments, 1 s approved except for Items that may be marked "dlsposltion not approved" or "withdrawn" In column 10.

245

Scanning x-ray microscope  

Science Conference Proceedings (OSTI)

A scanning x-ray microscope is described including: an x-ray source capable of emitting a beam of x-rays; a collimator positioned to receive the beam of x-rays and to collimate this beam, a focusing cone means to focus the beam of x-rays, directed by the collimator, onto a focal plane, a specimen mount for supporting a specimen in the focal plane to receive the focused beam of x-rays, and x-ray beam scanning means to relatively move the specimen and the focusing cone means and collimator to scan the focused x-ray beam across the specimen. A detector is disposed adjacent the specimen to detect flourescent photons emitted by the specimen upon exposure to the focused beam of x-rays to provide an electrical output representative of this detection. Means are included for displaying and/or recording the information provided by the output from the detector, as are means for providing information to the recording and/or display means representative of the scan rate and position of the focused x-ray beam relative to the specimen whereby the recording and/or display means can correlate the information received to record and/or display quantitive and distributive information as to the quantity and distribution of elements detected in the specimen. Preferably there is provided an x-ray beam modulation means upstream, relative to the direction of emission of the xray beam, of the focusing cone means.

Wang, C.

1982-02-23T23:59:59.000Z

246

A millikelvin scanning tunneling microscope with two independent scanning systems  

E-Print Network (OSTI)

We describe the design, construction and operation of a scanning tunneling microscope (STM) with two tips that can independently acquire simultaneous scans of a sample. The STM is mounted on a dilution refrigerator and the setup includes vibration isolation, rf-filtered wiring, an ultra high vacuum (UHV) sample preparation chamber and sample transfer mechanism. We present images and spectroscopy taken with superconducting Nb tips with the refrigerator at 35 mK that indicate that the effective temperature of our tips/sample is approximately 184 mK, corresponding to an energy resolution of 16 $\\mu$eV. Atomic resolution topographic images of an Au(100) surface taken with the inner and outer tips were found to have root mean square roughness of 1.75 $\\pm$ 0.01 pm and 3.55 $\\pm$ 0.03 pm respectively.

Roychowdhury, A; Anderson, J R; Lobb, C J; Wellstood, F C; Dreyer, M

2013-01-01T23:59:59.000Z

247

Electronic Thermometry in Tunable Tunnel Junction  

adjustable. The method does not require calibration against known temperature standards. When combined with scanning probe microscopy, ...

248

Probing Multiparton Correlations at CEBAF  

E-Print Network (OSTI)

In this talk, I explore the possibilities of probing the multiparton correlation functions at CEBAF at its current energy and the energies with its future upgrades.

Jianwei Qiu

1998-08-08T23:59:59.000Z

249

Visual-servoing optical microscopy  

DOE Patents (OSTI)

The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

Callahan, Daniel E. (Martinez, CA); Parvin, Bahram (Mill Valley, CA)

2011-05-24T23:59:59.000Z

250

Visual-servoing optical microscopy  

DOE Patents (OSTI)

The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time: quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

Callahan, Daniel E. (Martinez, CA); Parvin, Bahram (Hercules, CA)

2009-06-09T23:59:59.000Z

251

High Resolution Transmission Microscopy Characterization of an ...  

Science Conference Proceedings (OSTI)

High Resolution Transmission Microscopy Characterization of an Oxide ... Line Dislocation Dynamics Simulation of fundamental dislocation properties in ...

252

Microscopy Technique Could Help Computer Industry ...  

Science Conference Proceedings (OSTI)

Microscopy Technique Could Help Computer Industry Develop 3-D Components. From NIST Tech Beat: June 25, 2013. ...

2013-06-25T23:59:59.000Z

253

Transmission Electron Microscopy Studies on Lithium Battery ...  

Science Conference Proceedings (OSTI)

About this Abstract. Meeting, 2012 TMS Annual Meeting & Exhibition. Symposium , Energy Nanomaterials. Presentation Title, Transmission Electron Microscopy ...

254

Cost-free scan: a low-overhead scan path design methodology  

Science Conference Proceedings (OSTI)

Conventional scan design imposes considerable area and delay overhead by using larger scan flip-flops and additional scan wires without utilizing the functionality of the combinational logic. We propose a novel low-overhead scan design methodology, called ... Keywords: Scan design, DFT, Testing

Chih-Chang Lin; Mike Tien-Chien Lee; Malgorzata Marek-Sadowska; Kuang-Chien Chen

1995-12-01T23:59:59.000Z

255

Long duration ash probe  

DOE Patents (OSTI)

A long duration ash probe includes a pressure shell connected to a port in a combustor with a sample coupon mounted on a retractable carriage so as to retract the sample coupon within the pressure shell during sootblowing operation of the combustor. A valve mounted at the forward end of the pressure shell is selectively closeable to seal the sample coupon within the shell, and a heating element in the shell is operable to maintain the desired temperature of the sample coupon while retracted within the shell. The carriage is operably mounted on a pair of rails within the shell for longitudinal movement within the shell. A hollow carrier tube connects the hollow cylindrical sample coupon to the carriage, and extends through the carriage and out the rearward end thereof. Air lines are connected to the rearward end of the carrier tube and are operable to permit coolant to pass through the air lines and thence through the carrier tube to the sample coupon so as to cool the sample coupon.

Hurley, John P. (Grand Forks, ND); McCollor, Don P. (Grand Forks, ND); Selle, Stanley J. (Grand Forks, MN)

1994-01-01T23:59:59.000Z

256

Molecular probe technology detects bacteria without culture  

E-Print Network (OSTI)

clinical samples, the molecular probes for L. brevis werepublished the design of our molecular probes (Figure 1a) and3, “1“, a majority of the molecular probes for that genome

2012-01-01T23:59:59.000Z

257

Analytical Electron Microscopy examination of uranium contamination at the DOE Fernald operation site  

SciTech Connect

Analytical Electron Microscopy (AEM) has been used to identify uranium-bearing phases present in contaminated soils from the DOE Fernald operation site. A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and AEM was used in isolating and characterizing uranium-rich regions of the contaminated soils. Soil samples were prepared for transmission electron microscopy (TEM) by ultramicrotomy using an embedding resin previously employed for aquatic colloids and biological samples. This preparation method allowed direct comparison between SEM and TEM images. At the macroscopic level much of the uranium appears to be associated with clays in the soils; however, electron beam analysis revealed that the uranium is present as discrete phases, including iron oxides, silicates (soddyite), phosphates (autunites), and fluorite. Only low levels of uranium were actually within the clay minerals. The distribution of uranium phases was inhomogeneous at the submicron level.

Buck, E.C.; Dietz, N.L.; Bates, J.K.; Cunnane, J.C.

1993-02-01T23:59:59.000Z

258

Scanning retarding field analyzer for plasma profile measurements in the boundary of the Alcator C-Mod tokamak  

SciTech Connect

A new Retarding Field Analyzer (RFA) head has been created for the outer-midplane scanning probe system on the Alcator C-Mod tokamak. The new probe head contains back-to-back retarding field analyzers aligned with the local magnetic field. One faces 'upstream' into the field-aligned plasma flow and the other faces 'downstream' away from the flow. The RFA was created primarily to benchmark ion temperature measurements of an ion sensitive probe; it may also be used to interrogate electrons. However, its construction is robust enough to be used to measure ion and electron temperatures up to the last-closed flux surface in C-Mod. A RFA probe of identical design has been attached to the side of a limiter to explore direct changes to the boundary plasma due to lower hybrid heating and current drive. Design of the high heat flux (>100 MW/m{sup 2}) handling probe and initial results are presented.

Brunner, D.; LaBombard, B.; Ochoukov, R.; Whyte, D. [MIT PSFC Cambridge, Massachusetts 02139 (United States)

2013-03-15T23:59:59.000Z

259

Scan Energy AS | Open Energy Information  

Open Energy Info (EERE)

Scan Energy AS Jump to: navigation, search Name Scan Energy AS Place Dybvad, Denmark Zip DK-9352 Sector Solar, Wind energy Product Denmark-based solar and wind power project...

260

Nanoscience  

NLE Websites -- All DOE Office Websites (Extended Search)

of nanomaterials. Our instrumentation and facilities include: n ELPI n MOUDI n Electron and Scanning Probe Microscopy n Scanning Mobility Particle Sizer n Wide-Range...

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


261

Demonstration of Ballistic Electron Emission Microscopy / Spectroscopy on the Au/Si (001) system  

E-Print Network (OSTI)

The Ballistic Electron Emission Microscopy (BEEM) capabilities of a Scanning Tunneling Microscope (STM) have been verified. BEEM is used to analyze the characteristics of buried energy barriers and was developed as an extension of scanning tunneling microscopy; hence, the analytical capabilities of BEEM are on a manometer scale. To use BEEM, low-noise Au/Si (001) Schottky diodes have been fabricated. The diodes were macroscopically tested for their electrical properties using conventional current-voltage (I-V) techniques. The same diodes were then placed in an ultra-high vacuum STM system and analyzed with BEEM. The ballistic electron emission microscopy and scanning tunneling microscopy showed some correlation with the topography of the evaporated gold surface. The barrier heights of the diodes were extracted from the ballistic electron emission spectroscopy with the use of a simple one dimensional BEEM current model. Comparison between the barrier heights obtained with BEEM and conventional I-V techniques showed the localized barrier heights to be higher than the macroscopic barrier heights.

Drummond, Mary Alyssa

1997-01-01T23:59:59.000Z

262

ARM: Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)  

DOE Data Explorer (OSTI)

Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

Nitin Bharadwaj; Kevin Widener

263

N-detection under transparent-scan  

Science Conference Proceedings (OSTI)

We study the quality of test sequences under a test application scheme called transparent-scan as n -detection test sequences. We obtain transparent-scan sequences from combinational test sets. We show that for the same number of clock cycles ... Keywords: n-detection test sets, scan design, test generation

Irith Pomeranz

2005-06-01T23:59:59.000Z

264

Probe spectroscopy of quasienergy states  

E-Print Network (OSTI)

The present qubit technology, in particular in Josephson qubits, allows an unprecedented control of discrete energy levels. This motivates a new study of the old pump-probe problem, where a discrete quantum system is driven by a strong drive and simultaneously probed by a weaker one. The strong drive is included by the Floquet method and the resulting quasienergy states are then studied with the probe. We study a qubit where the harmonic drive has a significant longitudinal component relative to the static equilibrium state of the qubit. Both analytical and numerical methods are used to solve the problem. We present calculations with realistic parameters and compare the results with recent experimental results. A short introduction to the Floquet method and the probe absorption is given.

Matti Silveri; Jani Tuorila; Mika Kemppainen; Erkki Thuneberg

2013-01-02T23:59:59.000Z

265

Monitoring probe for groundwater flow  

DOE Patents (OSTI)

A monitoring probe for detecting groundwater migration. The monitor features a cylinder made of a permeable membrane carrying an array of electrical conductivity sensors on its outer surface. The cylinder is filled with a fluid that has a conductivity different than the groundwater. The probe is placed in the ground at an area of interest to be monitored. The fluid, typically saltwater, diffuses through the permeable membrane into the groundwater. The flow of groundwater passing around the permeable membrane walls of the cylinder carries the conductive fluid in the same general direction and distorts the conductivity field measured by the sensors. The degree of distortion from top to bottom and around the probe is precisely related to the vertical and horizontal flow rates, respectively. The electrical conductivities measured by the sensors about the outer surface of the probe are analyzed to determine the rate and direction of the groundwater flow.

Looney, Brian B. (Aiken, SC); Ballard, Sanford (Albuquerque, NM)

1994-01-01T23:59:59.000Z

266

Transmission Electron Microscopy Study of InN Nanorods  

E-Print Network (OSTI)

Transmission Electron Microscopy Study of InN Nanorods Z.epitaxy and studied by transmission electron microscopy,establish their quality. Transmission electron microscopy (

Liliental-Weber, Z.; Li, X.; Kryliouk, Olga; Park, H.J.; Mangum, J.; Anderson, T.

2008-01-01T23:59:59.000Z

267

Encoded Fiber-Optic Microsphere Arrays for Probing ProteinCarbohydrate Interactions**  

E-Print Network (OSTI)

Biosensors Encoded Fiber-Optic Microsphere Arrays for Probing Protein­Carbohydrate Interactions, such as robotic printing and fluorescence scanning devices. In the past year, several systems were described that present both natural and synthetically derived carbohydrate structures in array formats.[3] These systems

Ratner, Daniel M.

268

On single-molecule DNA sequencing with atomic force microscopy using functionalized carbon nanotube probes  

E-Print Network (OSTI)

A novel DNA sequencing method is proposed based on the specific binding nature of nucleotides and measured by an atomic force microscope (AFM). A single molecule of DNA is denatured and immobilized on an atomically fiat ...

Burns, Daniel James

2004-01-01T23:59:59.000Z

269

Three Dimensional X-Ray Scanning Micro/Nano-Diffraction Probe ...  

Science Conference Proceedings (OSTI)

... Magnetic Composite Materials · X-Ray Studies of Structural Effects Induced by Pulsed (30 Tesla), High Magnetic Fields at the Advanced Photon Source ...

270

Scanning ARM Cloud Radar Handbook  

SciTech Connect

The scanning ARM cloud radar (SACR) is a polarimetric Doppler radar consisting of three different radar designs based on operating frequency. These are designated as follows: (1) X-band SACR (X-SACR); (2) Ka-band SACR (Ka-SACR); and (3) W-band SACR (W-SACR). There are two SACRs on a single pedestal at each site where SACRs are deployed. The selection of the operating frequencies at each deployed site is predominantly determined by atmospheric attenuation at the site. Because RF attenuation increases with atmospheric water vapor content, ARM's Tropical Western Pacific (TWP) sites use the X-/Ka-band frequency pair. The Southern Great Plains (SGP) and North Slope of Alaska (NSA) sites field the Ka-/W-band frequency pair. One ARM Mobile Facility (AMF1) has a Ka/W-SACR and the other (AMF2) has a X/Ka-SACR.

Widener, K; Bharadwaj, N; Johnson, K

2012-06-18T23:59:59.000Z

271

Investigation of magnetic structure and magnetization process of yttrium iron garnet film by Lorentz microscopy and electron holography  

E-Print Network (OSTI)

. On the left-hand sides of b and c , schematic diagrams are added to show domain walls with white and black by photons or scanning probes.9 In this paper, the domain structure of YIG films, including its variation as shown by the white rectangle in Fig. 1. The corresponding TEM results are shown in Fig. 2, where

Krishnan, Kannan M.

272

Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope  

E-Print Network (OSTI)

We use a scanning tunneling microscope to probe single-electron charging phenomena in individual CdSe/ZnS (core/shell) quantum dots (QDs) at room temperature. The QDs are deposited on top of a bare Au thin film and form a ...

Bulovic, Vladimir

273

Frontiers of In Situ Transmission Electron Microscopy  

Science Conference Proceedings (OSTI)

... significance and versatility of in situ transmission electron microscopy (TEM) has ... applied stimulus is observed as it happens inside the microscope. ...

2013-05-29T23:59:59.000Z

274

Maximizing fluorescence collection efficiency in multiphoton microscopy  

E-Print Network (OSTI)

-depth limit in two-photon microscopy," J. Opt. Soc. Am. A 23(12), 3139­3149 (2006). 9. D. Kobat, M. E. Durst

Levene, Michael J.

275

Grand Opening Slated for Electron Microscopy Facility  

Science Conference Proceedings (OSTI)

4 days ago ... The Ohio State University Center for Electron Microscopy and Analysis ... There are also two X-ray diffractometer (XRD) systems, facilities for ...

276

Nanomanipulation and nanofabrication with multi-probe STM: From individual atoms to nanowires  

SciTech Connect

The wide variety of nanoscale structures and devices demands novel tools for handling, assembly, and fabrication at nanoscopic positioning precision. The manipulation tools should allow for in situ characterization and testing of fundamental building blocks, such as nanotubes and nanowires, as they are built into functional devices. In this paper, a bottom-up technique for nanomanipulation and nanofabrication is reported by using a 4-probe scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM). The applications of this technique are demonstrated in a variety of nanosystems, from manipulating individual atoms to bending, cutting, breaking carbon nanofibers, and constructing nanodevices for electrical characterizations. The combination of the wide field of view of SEM, the atomic position resolution of STM, and the flexibility of multiple scanning probes is expected to be a valuable tool for rapid prototyping in the nanoscience and nanotechnology.

Qin, Shengyong [ORNL; Kim, Tae Hwan [ORNL; Wang, Zhouhang [ORNL; Li, An-Ping [ORNL

2012-01-01T23:59:59.000Z

277

In situ laser processing in a scanning electron microscope  

Science Conference Proceedings (OSTI)

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {micro}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas [University of Tennessee, Knoxville (UTK); Fowlkes, Jason Davidson [ORNL; Rack, Prof. Philip [University of Tennessee, Knoxville (UTK); Moore, Tom [OmniProbe, Inc.; Magel, Greg [OmniProbe, Inc.; Hartfield, Cheryl [OmniProbe, Inc.

2012-01-01T23:59:59.000Z

278

In situ laser processing in a scanning electron microscope  

SciTech Connect

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {mu}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas A.; Magel, Gregory A.; Hartfield, Cheryl D.; Moore, Thomas M.; Fowlkes, Jason D.; Rack, Philip D. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

2012-07-15T23:59:59.000Z

279

ScanningTunneling Luminescence of Grain Boundaries in Cu(In,Ga)Se2  

DOE Green Energy (OSTI)

At the Laboratory, photon emission in semiconductors has been mapped in the nanoscale using scanning tunneling microscopy (STM). In this Solar Program Review Meeting, we report on the latest results obtained in Cu(In,Ga)Se2 (CIGS) thin films by this adapted STM. Scanning tunneling luminescence (STL) spectroscopy suggests that photons are emitted near the surface of CIGS. STL is excited either by (1) diffusion of tunneling electrons and subsequent recombination with available holes in CIGS or (2) impact ionization by hot electrons. Which process becomes predominant depends on the voltage applied to the STM tip. Photon mapping shows electronically active, extended defects near the surface of CIGS thin films.

Romero, M. J.; Jiang, C.-S.; Al-Jassim, M. M.; Noufi, R.

2005-01-01T23:59:59.000Z

280

Hand-held survey probe  

DOE Patents (OSTI)

A system for providing operational feedback to a user of a detection probe may include an optical sensor to generate data corresponding to a position of the detection probe with respect to a surface; a microprocessor to receive the data; a software medium having code to process the data with the microprocessor and pre-programmed parameters, and making a comparison of the data to the parameters; and an indicator device to indicate results of the comparison. A method of providing operational feedback to a user of a detection probe may include generating output data with an optical sensor corresponding to the relative position with respect to a surface; processing the output data, including comparing the output data to pre-programmed parameters; and indicating results of the comparison.

Young, Kevin L. (Idaho Falls, ID); Hungate, Kevin E. (Idaho Falls, ID)

2010-02-23T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


281

Method for motion tracking during tomographic scanning  

Method for motion tracking during tomographic scanning Note: The technology described above is an early stage opportunity. Licensing rights to this intellectual ...

282

Nanomaterials Analysis using a Scanning Electron Microscope ...  

NLE Websites -- All DOE Office Websites (Extended Search)

Nanomaterials Analysis using a Scanning Electron Microscope Technology available for licensing: Steradian X-ray detection system increases the detection capability of SEMs during...

283

CARS polarized microscopy of three-dimensional director structures in liquid crystals  

E-Print Network (OSTI)

We demonstrate three-dimensional vibrational imaging of director structures in liquid crystals using coherent anti-Stokes Raman scattering (CARS) polarized microscopy. Spatial mapping of the structures is based on sensitivity of a polarized CARS signal to orientation of anisotropic molecules in liquid crystals. As an example, we study structures in a smectic material and demonstrate that single-scan CARS and two-photon fluorescence images of molecular orientation patterns are consistent with each other and with the structure model.

Kachynski, A V; Prasad, P N; Smalyukh, I I

2007-01-01T23:59:59.000Z

284

CARS polarized microscopy of three-dimensional director structures in liquid crystals  

E-Print Network (OSTI)

We demonstrate three-dimensional vibrational imaging of director structures in liquid crystals using coherent anti-Stokes Raman scattering (CARS) polarized microscopy. Spatial mapping of the structures is based on sensitivity of a polarized CARS signal to orientation of anisotropic molecules in liquid crystals. As an example, we study structures in a smectic material and demonstrate that single-scan CARS and two-photon fluorescence images of molecular orientation patterns are consistent with each other and with the structure model.

A. V. Kachynski; A. N. Kuzmin; P. N. Prasad; I. I. Smalyukh

2007-10-18T23:59:59.000Z

285

Nuclear Physics with Electroweak Probes  

E-Print Network (OSTI)

In recent years, the italian theoretical Nuclear Physics community has played a leading role in the development of a unified approach, allowing for a consistent and fully quantitative description of the nuclear response to electromagnetic and weak probes. In this paper I review the main achievements in both fields, point out some of the open problems, and outline the most promising prospects.

Omar Benhar

2009-02-26T23:59:59.000Z

286

Neutron and Gamma Probe Application to Hanford Tank 241-SY-101  

SciTech Connect

A neutron (moisture-sensitive) and gamma (in-situ radiation) probe technique has been utilized at a number of Hanford radioactive waste tanks for many years. This technology has been adapted for use in tank 241-SY-101's two Multifunction Instrument Trees (MITs) which have a hollow dry-well center opening two inches (51 cm) in diameter. These probes provide scans starting within a few inches of the tank bottom and traversing up through the top of the tank revealing a variety of waste features as a function of tank elevation. These features have been correlated with void fraction data obtained independently from two other devices, the Retained Gas Sampler (RGS) and the Void Fraction Instrument (VFI). The MIT probes offer the advantage of nearly continuous count-rate versus elevation scans and they can be operated significantly more often and at lower cost than temperature probes or the RGS or VFI devices while providing better depth resolution. The waste level in tank 241-SY-101 had been rising at higher rates than expected during 1998 and early 1999 indicating an increasing amount of trapped gas in the waste. The use of the MIT probes has assisted in evaluating changes in crust thickness and level and also in estimating relative changes in gas stored in the crust. This information is important in assuring that the tank remains in a safe configuration and will support safe waste transfer when those operations take place.

CANNON, N.S.

2000-02-01T23:59:59.000Z

287

Cantilevered probe detector with piezoelectric element  

DOE Patents (OSTI)

A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

2013-04-30T23:59:59.000Z

288

Cantilevered probe detector with piezoelectric element  

DOE Patents (OSTI)

A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

Adams, Jesse D. (Reno, NV); Sulchek, Todd A. (Oakland, CA); Feigin, Stuart C. (Reno, NV)

2012-07-10T23:59:59.000Z

289

Good Vibrations Probe Innards of Molecular Electronic ...  

Science Conference Proceedings (OSTI)

... Probing molecules in integrated silicon-molecule-metal junctions by inelastic tunneling spectroscopy. ACS Nano Letters, 8, 478 (2008).

2012-11-02T23:59:59.000Z

290

Improved double planar probe data analysis technique  

Science Conference Proceedings (OSTI)

Plasma electron number density and ion number density in a dc multidipole weakly collisional Ar plasma are measured with a single planar Langmuir probe and a double planar probe, respectively. A factor of two discrepancy between the two density measurements is resolved by applying Sheridan's empirical formula [T. E. Sheridan, Phys. Plasmas 7, 3084 (2000)] for sheath expansion to the double probe data.

Ghim, Young-chul; Hershkowitz, Noah [Department of Engineering Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)

2009-03-15T23:59:59.000Z

291

pH Meter probe assembly  

DOE Patents (OSTI)

An assembly for mounting a pH probe in a flowing solution, such as a sanitary sewer line, which prevents the sensitive glass portion of the probe from becoming coated with grease, oil, and other contaminants, whereby the probe gives reliable pH indication over an extended period of time. The pH probe assembly utilizes a special filter media and a timed back-rinse feature for flushing clear surface contaminants of the filter. The flushing liquid is of a known pH and is utilized to check performance of the probe.

Hale, Charles J. (San Jose, CA)

1983-01-01T23:59:59.000Z

292

pH Meter probe assembly  

DOE Patents (OSTI)

An assembly for mounting a pH probe in a flowing solution, such as a sanitary sewer line, which prevents the sensitive glass portion of the probe from becoming coated with grease, oil, and other contaminants, whereby the probe gives reliable pH indication over an extended period of time. The pH probe assembly utilizes a special filter media and a timed back-rinse feature for flushing clear surface contaminants of the filter. The flushing liquid is of a known pH and is utilized to check performance of the probe. 1 fig.

Hale, C.J.

1983-11-15T23:59:59.000Z

293

Laser Scanning Two Photon and Confocal Microscope  

Science Conference Proceedings (OSTI)

... The SP5 is a laser scanning two-photon and confocal microscope equipped with ... nm HeNe, and tunable IR (680 nm - 1060 nm) lasers * 4 internal ...

2012-10-01T23:59:59.000Z

294

Frequency Scanned Interferometry for ILC Tracker Alignment  

E-Print Network (OSTI)

In this paper, we report high-precision absolute distance and vibration measurements performed with frequency scanned interferometry. Absolute distance was determined by counting the interference fringes produced while scanning the laser frequency. High-finesse Fabry-Perot interferometers were used to determine frequency changes during scanning. A dual-laser scanning technique was used to cancel drift errors to improve the absolute distance measurement precision. A new dual-channel FSI demonstration system is also presented which is an interim stage toward practical application of multi-channel distance measurement. Under realistic conditions, a precision of 0.3 microns was achieved for an absolute distance of 0.57 meters. A possible optical alignment system for a silicon tracker is also presented.

Hai-Jun Yang; Tianxiang Chen; Keith Riles

2011-09-12T23:59:59.000Z

295

4.1 Search and Scan Facility  

NLE Websites -- All DOE Office Websites (Extended Search)

2 Tuning of the Up: 4. Special Features Previous: 4. Special Features Contents 4.1 Search and Scan Facility The level-of-detail support provided in SLOG-2 and Jumpshot-4's timeline...

296

Transmission Electron Microscope and Scanning Electron Microscopes -  

NLE Websites -- All DOE Office Websites (Extended Search)

Facilities > Transmission Electron Facilities > Transmission Electron Microscope and Scanning Electron Microscopes FACILITIES Transmission Electron Microscope and Scanning Electron Microscopes Overview Other Facilities Work with Argonne Contact us For Employees Site Map Help Join us on Facebook Follow us on Twitter NE on Flickr Transmission Electron Microscope and Scanning Electron Microscopes The research activities of the Corrosion and Mechanics of Materials Section are supported by complete metallography/sample preparation rooms equipped with several optical and electron microscopes: a Transmission Electron Microscope and two Scanning Electron Microscopes. Bookmark and Share Transmission electron microscope (TEM) Detail of JEOL 100CXII TEM Figure 1: Detail of JEOL 100CXII TEM. Click on image to view larger image.

297

The FTS scans that made up the  

E-Print Network (OSTI)

Kitt Peak Solar Flux Atlas by Kurucz, Furenlid, Brault, and Testerman 1984 have been re-reduced. The scans listed in Table 1 ( = Figure 0) were smoothed with a 3-point Gaussian to simplify continuum placement and matching overlapping scans. An approximate atmospheric model was determined for each FTS scan. Large-scale features produced by O3 and O2 dimer were computed and divided out. The telluric line spectrum was computed using HITRAN and other line data for H2O, O2, and CO2. The line parameters were adjusted for an approximate match to the observed spectra. The wavelength scale for the scans was redetermined. The solar continuum level was found by fitting a smooth curve to high points in the observed spectrum while comparing with the product of the computed solar spectrum times the computed telluric spectrum. The spectrum was normalized to the fitted continuum to produce a residual flux spectrum for each FTS scan. Those scans were divided by the computed telluric spectra to produce residual irradiance spectra. Artifacts from wavelength mismatches, deep lines, etc, were removed by hand and replaced by

Robert L. Kurucz

2005-01-01T23:59:59.000Z

298

COMBINED FLUORESCENT AND GOLD PROBES FOR MICROSCOPIC AND MORPHOLOGICAL INVESTIGATIONS.  

SciTech Connect

Nanogold{reg_sign}, a gold cluster with a core of gold atoms 1.4 nm in diameter, has proven to be a superior probe label for electron microscopy (EM), giving both higher labeling density and improved access to previously hindered or restricted antigens. It may be visualized by autometallography (AMG) for use in light microscopy (LM): silver-and gold-amplified Nanogold detection has proven to be one of the most sensitive methods available for the detection of low copy number targets such as viral DNA in cells and tissue specimens. AMG enhancement has also made Nanogold an effective detection label in blots and gels. The following protocols will be described: Labeling of nuclear components in cells. Protocol for in situ hybridization and detection with fluorescein-Nanogold--or Cy3{trademark}-Nanogold-labeled streptavidin. Nanogold is an inert molecule, and generally does not interact with biological molecules unless a specific chemical reactivity is introduced into the molecule. Conjugates are prepared using site-specific chemical conjugation through reactive chemical functionalities introduced during Nanogold preparation, which allows the gold label to be attached to a specific site on the conjugate biomolecule. For example, a maleimido-Nanogold derivative, which is specific for thiol binding, is frequently attached to the hinge region of an antibody at a unique thiol site generated by selective reduction of a hinge disulfide. This site is remote from the antigen combining region, and the Nanogold, therefore, does not compromise target binding. Nanogold may also be prepared with specific reactivity towards amines or other unique chemical groups. This mode of attachment enables the preparation of probes labeled with both Nanogold and fluorescent labels. Different chemical reactivities are used to attach the Nanogold and the fluorescent groups to different sites in the conjugate biomolecule, as shown in Figure 7.1. In this manner, the two labels are spaced sufficiently far apart that fluorescent resonance energy transfer does not quench the fluorescent signal, and the probes may be used to label specimens for fluorescent and EM observation in a single staining procedure. This reduces the complexity of the staining procedure, allowing less specimen perturbation, and also enables a higher degree of correlation between the fluorescence and EM localization of the target, thus increasing the usefulness of the complementary data sets. Since gold and fluorescent-labeled probes are often used at different concentrations under different conditions, optimum procedures for the use of fluorescent and gold probes may entail some degree of compromise between the most appropriate conditions for the two types of probes. However, the chemical stability of the Nanogold label means that it is generally stable to a wide range of use conditions, and the following protocols have been found to be effective for labeling specimens with combined fluorescein and Nanogold-labeled antibody Fab' probes and with combined Cy3 and Nanogold-labeled streptavidin.

POWELL,R.D.HAINFELD,J.F.

2002-04-17T23:59:59.000Z

299

Scanning tip microwave near field microscope  

SciTech Connect

A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

Xiang, Xiao-Dong (Alameda, CA); Schultz, Peter G. (Oakland, CA); Wei, Tao (Albany, CA)

1998-01-01T23:59:59.000Z

300

Nanolithography for AutoProbe Operating Instructions  

E-Print Network (OSTI)

, Microlever, ScanMaster, MicroCell, Materials Analysis Package, MAP, ProScan, MapPlot, the TM logo, and Thermo.......................................................................................... 5 Installing Nanolithography Software....................................................................................... 17 Starting Nanolithography and Loading an Image............................................... 18

Geim, Andre

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


301

Microsoft Word - PumpProbe  

NLE Websites -- All DOE Office Websites (Extended Search)

Pump/Probe Pump/Probe Resources Available - BE Current Mid 2014 Mid 2016 Beamline X-ray Source Total Total Total NSLS-I 0.25 0.15 0 U4B Bend 0.05 0 0 U4IR Bend 0.2 0.15 0 APS 4.75 4.75 4.75 4-ID-C CPU 0 0 0 7-ID-C&D Undulator 1 1 1 7-BM-B Bend 1 1 1 10-ID-B Undulator 0.5 0.5 0.5 11-ID-D Undulator 1 1 1 14-ID-B Undulator 1 1 1 20-ID Undulator 0.25 0.25 0.25 ALS 3 3 3 4.0.2 EPU 0 0 0 6.0.1 Undulator 1 1 1 6.0.2 Undulator 1 1 1 6.1.2 Bend 0 0 0 9.0.2 Undulator 1 1 1 11.0.1 EPU 0 0 0 11.0.2 EPU 0 0 0 SSRL 0.15 0.45 0.45

302

H2Scan LLC | Open Energy Information  

Open Energy Info (EERE)

H2Scan LLC H2Scan LLC Jump to: navigation, search Name H2Scan LLC Place Valencia, California Zip 91355 Sector Hydro, Hydrogen Product Hydrogen specific sensing systems, uniquely able to detect hydrogen against virtually any background gases. Coordinates 39.468791°, -0.376913° Loading map... {"minzoom":false,"mappingservice":"googlemaps3","type":"ROADMAP","zoom":14,"types":["ROADMAP","SATELLITE","HYBRID","TERRAIN"],"geoservice":"google","maxzoom":false,"width":"600px","height":"350px","centre":false,"title":"","label":"","icon":"","visitedicon":"","lines":[],"polygons":[],"circles":[],"rectangles":[],"copycoords":false,"static":false,"wmsoverlay":"","layers":[],"controls":["pan","zoom","type","scale","streetview"],"zoomstyle":"DEFAULT","typestyle":"DEFAULT","autoinfowindows":false,"kml":[],"gkml":[],"fusiontables":[],"resizable":false,"tilt":0,"kmlrezoom":false,"poi":true,"imageoverlays":[],"markercluster":false,"searchmarkers":"","locations":[{"text":"","title":"","link":null,"lat":39.468791,"lon":-0.376913,"alt":0,"address":"","icon":"","group":"","inlineLabel":"","visitedicon":""}]}

303

WorldScan | Open Energy Information  

Open Energy Info (EERE)

WorldScan WorldScan Jump to: navigation, search LEDSGP green logo.png FIND MORE DIA TOOLS This tool is part of the Development Impacts Assessment (DIA) Toolkit from the LEDS Global Partnership. Tool Summary LAUNCH TOOL Name: WorldScan Agency/Company /Organization: Netherlands Bureau for Economic Policy Analysis (CPB) Sector: Climate, Energy Complexity/Ease of Use: Moderate Website: www.gtap.agecon.purdue.edu/resources/res_display.asp?RecordID=1923 Related Tools Marginal Abatement Cost Tool (MACTool) Greenhouse Gas and Air Pollution Interactions and Synergies (GAINS) Gold Standard Program Model ... further results A recursively dynamic general equilibrium model for the world economy, developed for the analysis of long-term issues in international economics; used both as a tool to construct long-term scenarios and as an instrument

304

May 21, 2008  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscopy Video Transcript September 2010 Scott Lea My name is Scott Lea, I'm the Capability Steward for EMSL's Microscopy Group. My expertise is in scanning probe microscopy and...

305

Scanning capacitance microscopy of AlGaN/GaN heterostructure field-effect transistor epitaxial layer structures  

E-Print Network (OSTI)

, University of California, San Diego, La Jolla, California, 92093-0407 J. M. Redwing and K. S. Boutros ATMI

Yu, Edward T.

306

Nonlocal, grating-coupled scattering-type near-field scanning optical microscopy of individual gold nano-particles  

E-Print Network (OSTI)

nano-particles D. Sadiq, J. Shirdel*, and C. Lienau Institut für Physik, Carl von Ossietzky Universität nano-particles. We demonstrate sub-30-nm-resolution imaging of localized SPP fields. By comparison onto a photodetector. When imaging small individual gold nano-particles with

Park, Namkyoo

307

Classification of Multiple Types of Organic Carbon Composition in Atmospheric Particles by Scanning Transmission X-Ray Microscopy Analysis  

E-Print Network (OSTI)

al. , 2005), and biomass combustion (Braun, 2005; Tivanskigenerated from biomass (wood) combustion, however, it is

Takahama, S.

2008-01-01T23:59:59.000Z

308

Scanning and storage of electrophoretic records  

SciTech Connect

An electrophoretic record that includes at least one gel separation is mounted for motion laterally of the separation record. A light source is positioned to illuminate at least a portion of the record, and a linear array camera is positioned to have a field of view of the illuminated portion of the record and orthogonal to the direction of record motion. The elements of the linear array are scanned at increments of motion of the record across the field of view to develop a series of signals corresponding to intensity of light at each element at each scan increment.

McKean, Ronald A. (Royal Oak, MI); Stiegman, Jeff (Ann Arbor, MI)

1990-01-01T23:59:59.000Z

309

Scanning and Mapping Strategies for CMB Experiments  

E-Print Network (OSTI)

CMB anisotropy experiments seeking to make maps with more pixels than the 6144 pixels used by the COBE DMR need to address the practical issues of the computer time and storage required to make maps. A simple, repetitive scan pattern reduces these requirements but leaves the experiment vulnerable to systematic errors and striping in the maps. In this paper I give a time-ordered method for map-making with one-horned experiments that has reasonable memory and CPU needs but can handle complex COBE-like scans paths and 1/f noise.

Edward L. Wright

1996-11-29T23:59:59.000Z

310

PROBING DENSE NUCLEAR MATTER VIA NUCLEAR COLLISIONS  

E-Print Network (OSTI)

University of California. LBL-12095 Probing Dense NuclearMatter Nuclear Collisions* v~a H. Stocker, M.Gyulassy and J. Boguta Nuclear Science Division Lawrence

Stocker, H.

2012-01-01T23:59:59.000Z

311

Optical Backscatter Probe for Sensing Particulate Matter  

By supplying light from the fiber optic probe into specific engine locations, ... systems to optimize engine performance • On-board diagnostics required by regulatory

312

Versatile Probes for Enhanced Protein Behavior Mapping ...  

Summary. Researchers at PNNL have developed new probes that specifically bind to peptide tags, which are amino acid sequences engineered into any ...

313

Automated Surface Sampling Probe for Mass Spectrometry  

Dr. Gary Van Berkel and colleagues have developed a liquid microjunction surface sampling probe (LMJ?SSP). The LMJ?SSP provides mass spectrometry with ...

314

MIT validation probe acceptance test procedure  

SciTech Connect

As part of the Multi-Functional Instrument Trees (MITs) a Validation Probe is being fabricated by Los Alamos National Laboratories (LANL). The Validation Probe assembly is equipped with a Winch, depth counter, and a Resistance Temperature Detector (RTD) which will render a means for verifying the temperature readings of which will render a means for verifying the temperature readings of the MIT thermocouples. The purpose of this Acceptance Test Procedure (ATP) is to provide verification that the Validation Probe functions properly and accordingly to LANL design and specification. This ATP will be used for all Validation Probes procured from LANL. The ATP consists of a receiving inspection, RTD ambient temperature; RTD electrical failure, RTD insulation resistance, and accurate depth counter operation inspections. The Validation Probe is composed of an intank probe, a cable and winching system, and a riser extension (probe guide) which bolts onto the MIT. The validation`s thermal sensor is an RTD that is housed in a 0.062 inch diameter, magnesium oxide fill, 316 stainless steel tube. The sheath configuration provides a means for spring loading the sensor firmly against the validation tube`s inner wall. A 45 pound cylindrical body is connected above the sheath and is used as a force to lower the probe into the tank. This cylindrical body also provides the means to interconnect both electrically and mechanically to the winch system which lowers the probe to a specified location within the validation tube located in the tank.

Escamilla, S.A.

1994-08-23T23:59:59.000Z

315

Scanned_Joint_Declaration_(Italian).pdf | Department of Energy  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

JointDeclaration(Italian).pdf ScannedJointDeclaration(Italian).pdf ScannedJointDeclaration(Italian).pdf More Documents & Publications FTCP Face to Face Meeting - March 30,...

316

In-situ spectrophotometric probe  

DOE Patents (OSTI)

A spectrophotometric probe is described for in situ absorption spectra measurements comprising a first optical fiber carrying light from a remote light source, a second optical fiber carrying light to a remote spectrophotometer, the proximal ends of the first and second optical fibers parallel and co-terminal, a planoconvex lens to collimate light from the first optical fiber, a reflecting grid positioned a short distance from the lens to reflect the collimated light back to the lens for focusing on the second optical fiber. The lens is positioned with the convex side toward the optical fibers. A substrate for absorbing analyte or an analyte and reagent mixture may be positioned between the lens and the reflecting grid. 5 figs.

Prather, W.S.

1992-12-15T23:59:59.000Z

317

Millimeter-wave active probe  

DOE Patents (OSTI)

A millimeter-wave active probe for use in injecting signals with frequencies above 50GHz to millimeter-wave and ultrafast devices and integrated circuits including a substrate upon which a frequency multiplier consisting of filter sections and impedance matching sections are fabricated in uniplanar transmission line format. A coaxial input and uniplanar 50 ohm transmission line couple an approximately 20 GHz input signal to a low pass filter which rolls off at approximately 25 GHz. An input impedance matching section couples the energy from the low pass filter to a pair of matched, antiparallel beam lead diodes. These diodes generate odd-numberd harmonics which are coupled out of the diodes by an output impedance matching network and bandpass filter which suppresses the fundamental and third harmonics and selects the fifth harmonic for presentation at an output.

Majidi-Ahy, Gholamreza (Sunnyvale, CA); Bloom, David M. (Portola Valley, CA)

1991-01-01T23:59:59.000Z

318

In-situ spectrophotometric probe  

DOE Patents (OSTI)

A spectrophotometric probe for in situ absorption spectra measurements comprising a first optical fiber carrying light from a remote light source, a second optical fiber carrying light to a remote spectrophotometer, the proximal ends of the first and second optical fibers parallel and coterminal, a planoconvex lens to collimate light from the first optical fiber, a reflecting grid positioned a short distance from the lens to reflect the collimated light back to the lens for focussing on the second optical fiber. The lens is positioned with the convex side toward the optical fibers. A substrate for absorbing analyte or an analyte and reagent mixture may be positioned between the lens and the reflecting grid. 3 figs.

Prather, W.S.

1990-02-12T23:59:59.000Z

319

In-situ spectrophotometric probe  

DOE Patents (OSTI)

A spectrophotometric probe for in situ absorption spectra measurements comprising a first optical fiber carrying light from a remote light source, a second optical fiber carrying light to a remote spectrophotometer, the proximal ends of the first and second optical fibers parallel and coterminal, a planoconvex lens to collimate light from the first optical fiber, a reflecting grid positioned a short distance from the lens to reflect the collimated light back to the lens for focussing on the second optical fiber. The lens is positioned with the convex side toward the optical fibers. A substrate for absorbing analyte or an analyte and reagent mixture may be positioned between the lens and the reflecting grid.

Prather, William S. (2419 Dickey Rd., Augusta, GA 30906)

1992-01-01T23:59:59.000Z

320

Scanning the Technology Energy Infrastructure Defense Systems  

E-Print Network (OSTI)

of their own telecommunications systems, which often consist of backbone fiber-optic or microwave connectingScanning the Technology Energy Infrastructure Defense Systems MASSOUD AMIN, SENIOR MEMBER, IEEE systems and to develop de- fense plans to protect the network against extreme contingencies caused

Amin, S. Massoud

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


321

PNNL SA 95506 Scan to learn more  

E-Print Network (OSTI)

PNNL SA 95506 Scan to learn more www.pnnl.gov At Pacific Northwest National Laboratory, we are transforming the world through courageous discovery and innovation. The evidence is all around us. PNNL called PNNL) developed the standards and devices for setting and measuring radiation doses received

322

Aberration-Coreected Electron Microscopy at Brookhaven National Laboratory  

Science Conference Proceedings (OSTI)

The last decade witnessed the rapid development and implementation of aberration correction in electron optics, realizing a more-than-70-year-old dream of aberration-free electron microscopy with a spatial resolution below one angstrom [1-9]. With sophisticated aberration correctors, modern electron microscopes now can reveal local structural information unavailable with neutrons and x-rays, such as the local arrangement of atoms, order/disorder, electronic inhomogeneity, bonding states, spin configuration, quantum confinement, and symmetry breaking [10-17]. Aberration correction through multipole-based correctors, as well as the associated improved stability in accelerating voltage, lens supplies, and goniometers in electron microscopes now enables medium-voltage (200-300kV) microscopes to achieve image resolution at or below 0.1nm. Aberration correction not only improves the instrument's spatial resolution but, equally importantly, allows larger objective lens pole-piece gaps to be employed thus realizing the potential of the instrument as a nanoscale property-measurement tool. That is, while retaining high spatial resolution, we can use various sample stages to observe the materials response under various temperature, electric- and magnetic- fields, and atmospheric environments. Such capabilities afford tremendous opportunities to tackle challenging science and technology issues in physics, chemistry, materials science, and biology. The research goal of the electron microscopy group at the Dept. of Condensed Matter Physics and Materials Science and the Center for Functional Nanomaterials, as well as the Institute for Advanced Electron Microscopy, Brookhaven National Laboratory (BNL), is to elucidate the microscopic origin of the physical- and chemical-behavior of materials, and the role of individual, or groups of atoms, especially in their native functional environments. We plan to accomplish this by developing and implementing various quantitative electron microscopy techniques in strongly correlated electron systems and nanostructured materials. As a first step, with the support of Materials Science Division, Office of Basic Energy Science, US Department of Energy, and the New York State Office of Science, Technology, and Academic Research, recently we acquired three aberration-corrected electron microscopes from the three major microscope manufacturers, i.e., JEOL, Hitachi, and FEI. The Hitachi HD2700C is equipped with a probe corrector, the FEI Titan 80-300 has an imaging corrector, while the JEOL2200MCO has both. All the correctors are of the dual-hexapole type, designed and manufactured by CEOS GmbH based on the design due to Rose and Haider [3, 18]. All these three are one-of-a-kind in the US, designed for specialized capabilities in characterizing nanoscale structure. In this chapter, we review the performance of these state-of-the art instruments and the new challenges associated with the improved spatial resolution, including the environment requirements of the laboratory that hosts these instruments. Although each instrument we describe here has its own strengths and drawbacks, it is not our intention to rank them in terms of their performance, especially their spatial resolution in imaging.

Zhu,Y.; Wall, J.

2008-04-01T23:59:59.000Z

323

Scanning electron microscopic analyses of Ferrocyanide tank wastes for the Ferrocyanide safety program  

Science Conference Proceedings (OSTI)

This is Fiscal Year 1995 Annual Report on the progress of activities relating to the application of scanning electron microscopy in addressing the Ferrocyanide Safety Issue associated with Hanford Site high-level radioactive waste tanks. The status of the FY 1995 activities directed towards establishing facilities capable of providing SEM based micro-characterization of ferrocyanide tank wastes is described. A summary of key events in the SEM task over FY 1995 and target activities in FY 1996 are presented. A brief overview of the potential applications of computer controlled SEM analytical data in light of analyses of ferrocyanide simulants performed by an independent contractor is also presented

Callaway, W.S.

1995-09-01T23:59:59.000Z

324

Microscopic Probes of High-Temperature Superconductivity  

Science Conference Proceedings (OSTI)

The granularity of the cuprate superconductors limits the effectiveness of many experimental probes that average over volumes containing many atoms. This report presents theoretical studies on muon spin relaxation and positron annihilation, two microscopic experimental techniques that can probe the properties of both high- and low-temperature superconductors on the atomic scale.

1992-07-01T23:59:59.000Z

325

Time-resolved multiple probe spectroscopy  

SciTech Connect

Time-resolved multiple probe spectroscopy combines optical, electronic, and data acquisition capabilities to enable measurement of picosecond to millisecond time-resolved spectra within a single experiment, using a single activation pulse. This technology enables a wide range of dynamic processes to be studied on a single laser and sample system. The technique includes a 1 kHz pump, 10 kHz probe flash photolysis-like mode of acquisition (pump-probe-probe-probe, etc.), increasing the amount of information from each experiment. We demonstrate the capability of the instrument by measuring the photolysis of tungsten hexacarbonyl (W(CO){sub 6}) monitored by IR absorption spectroscopy, following picosecond vibrational cooling of product formation through to slower bimolecular diffusion reactions on the microsecond time scale.

Greetham, G. M.; Sole, D.; Clark, I. P.; Parker, A. W.; Pollard, M. R.; Towrie, M. [Central Laser Facility, Science and Technology Facilities Council, Research Complex at Harwell, Rutherford Appleton Laboratory, Harwell, Oxfordshire, OX11 0QX (United Kingdom)

2012-10-15T23:59:59.000Z

326

Interactive visualization for network and port scan detection  

Science Conference Proceedings (OSTI)

Many times, network intrusion attempts begin with either a network scan, where a connection is attempted to every possible destination in a network, or a port scan, where a connection is attempted to each port on a given destination. Being able to detect ... Keywords: information visualization, intrusion detection, network scans, network security, port scans, user interfaces

Chris Muelder; Kwan-Liu Ma; Tony Bartoletti

2005-09-01T23:59:59.000Z

327

Rapid Scan AERI Observations: Benefits and Analysis  

NLE Websites -- All DOE Office Websites (Extended Search)

Rapid Scan AERI Observations: Benefits and Analysis Rapid Scan AERI Observations: Benefits and Analysis W. F. Feltz, D. D. Turner, R. O. Knuteson, and R. G. Dedecker Space Science and Engineering Center Cooperative Institute of Mesoscale Meteorological Studies University of Wisconsin-Madison Madison, Wisconsin D. D. Turner Pacific Northwest National Laboratory Richland, Washington Introduction The U.S. Department of Energy's (DOE's) Atmospheric Radiation Measurement (ARM) Program has funded the development of the atmospheric emitted radiance interferometer (AERI). This has led to a hardened, autonomous system that measures downwelling infrared (IR) radiance at high-spectral resolution. Seven AERI systems have been deployed around the world as part of the ARM Program. The initial goal of these instruments was to characterize the clear-sky IR emission from the atmosphere,

328

High-speed massively parallel scanning  

DOE Patents (OSTI)

A new technique for recording a series of images of a high-speed event (such as, but not limited to: ballistics, explosives, laser induced changes in materials, etc.) is presented. Such technique(s) makes use of a lenslet array to take image picture elements (pixels) and concentrate light from each pixel into a spot that is much smaller than the pixel. This array of spots illuminates a detector region (e.g., film, as one embodiment) which is scanned transverse to the light, creating tracks of exposed regions. Each track is a time history of the light intensity for a single pixel. By appropriately configuring the array of concentrated spots with respect to the scanning direction of the detection material, different tracks fit between pixels and sufficient lengths are possible which can be of interest in several high-speed imaging applications.

Decker, Derek E. (Byron, CA)

2010-07-06T23:59:59.000Z

329

Laser scanning system for object monitoring  

DOE Patents (OSTI)

A laser scanner is located in a fixed position to have line-of-sight access to key features of monitored objects. The scanner rapidly scans pre-programmed points corresponding to the positions of retroreflecting targets affixed to the key features of the objects. The scanner is capable of making highly detailed scans of any portion of the field of view, permitting the exact location and identity of targets to be confirmed. The security of an object is verified by determining that the cooperative target is still present and that its position has not changed. The retroreflecting targets also modulate the reflected light for purposes of returning additional information back to the location of the scanner.

McIntyre, Timothy James [Knoxville, TN; Maxey, Lonnie Curtis [Powell, TN; Chiaro, Jr; John, Peter [Clinton, TN

2008-04-22T23:59:59.000Z

330

Circular zig-zag scan video format  

DOE Patents (OSTI)

A circular, ziz-zag scan for use with vidicon tubes. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal.

Peterson, C. Glen (Los Alamos, NM); Simmons, Charles M. (Los Alamos, NM)

1992-01-01T23:59:59.000Z

331

Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements  

E-Print Network (OSTI)

Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is encountered in a number of different experimental circumstances. The scientists employing atomic force microscopy (AFM) have long focused their efforts to understand the surface-related noise issues via variants of AFM techniques, such as Kelvin probe force microscopy or electric force microscopy. Recently, the physicists investigating quantum vacuum fluctuation phenomena between two closely-spaced objects have also begun to collect experimental evidence indicating a presence of surface effects neglected in their previous analyses. It now appears that the two seemingly disparate science communities are encountering effects rooted in the same surface phenomena. In this report, we suggest specific experimental tasks to be performed in the near future that are crucial not only for fostering needed collaborations between the two communities, but also for providing valuable data on the surface effects in order to draw the most realistic conclusion about the actual contribution of the Casimir force (or van der Waals force) between a pair of real materials.

W. J. Kim; U. D. Schwarz

2010-10-18T23:59:59.000Z

332

Probing Signal Design for Power System Identification  

Science Conference Proceedings (OSTI)

This paper investigates the design of effective input signals for low-level probing of power systems. In 2005, 2006, and 2008 the Western Electricity Coordinating Council (WECC) conducted four large-scale system wide tests of the western interconnected power system where probing signals were injected by modulating the control signal at the Celilo end of the Pacific DC intertie. A major objective of these tests is the accurate estimation of the inter-area electromechanical modes. A key aspect of any such test is the design of an effective probing signal that leads to measured outputs rich in information about the modes. This paper specifically studies low-level probing signal design for power-system identification. The paper describes the design methodology and the advantages of this new probing signal which was successfully applied during these tests. This probing input is a multi-sine signal with its frequency content focused in the range of the inter-area modes. The period of the signal is over two minutes providing high-frequency resolution. Up to 15 cycles of the signal are injected resulting in a processing gain of 15. The resulting system response is studied in the time and frequency domains. Because of the new probing signal characteristics, these results show significant improvement in the output SNR compared to previous tests.

Pierre, John W.; Zhou, Ning; Tuffner, Francis K.; Hauer, John F.; Trudnowski, Daniel J.; Mittelstadt, William

2010-05-31T23:59:59.000Z

333

Quantitative imaging of living cells by deep ultraviolet microscopy  

E-Print Network (OSTI)

Developments in light microscopy over the past three centuries have opened new windows into cell structure and function, yet many questions remain unanswered by current imaging approaches. Deep ultraviolet microscopy ...

Zeskind, Benjamin J

2006-01-01T23:59:59.000Z

334

Electron Microscopy Study of Tin Whisker Growth  

Science Conference Proceedings (OSTI)

The growth of tin whiskers formed on sputtered tin layers deposited on brass was studied using electron microscopy. The occurrence of whiskers appeared to be largely independent of the macroscopic stress state in the film; rather it was microscopic compressive stresses arising from the formation of an intermetallic phase that appeared to be the necessary precursor. Whisker morphology was a result of whether nucleation had occurred on single grains or on multiple grains. In the latter case, the whiskers had a fluted or striated surface. The formation of whiskers on electron transparent samples was demonstrated. These samples showed the whiskers were monocrystalline and defect free, and that the growth direction could be determined.

Norton, Murray G. (Washington State University); Lebret, Joel (8392)

2003-03-30T23:59:59.000Z

335

COMPLETED: Nanoscale Thermal Properties Project  

Science Conference Proceedings (OSTI)

... To this end, we are advancing nano-thermomechanometry by exploiting a scanned probe microscopy heating tip method based on batch ...

2012-10-05T23:59:59.000Z

336

sunday/monday program  

Science Conference Proceedings (OSTI)

Feb 15, 2009 ... Characterization of Noble Metal Core Shell Nanostructures via Scanning. Probe Microscopy ..... search for them much earlier. This will lead to a ...

337

Staff Listings/Contact Information | U.S. DOE Office of Science...  

Office of Science (SC) Website

Dr. Lane Wilson Program Manager X-ray Scattering Dr. Jane Zhu Program Manager Electron and Scanning Probe Microscopies Division Phone Number: (301) 903-3427 Fax: (301)...

338

Publications Since 1983 1. Bright, DS, R. Myklebust, D. ...  

Science Conference Proceedings (OSTI)

... Maps in Electron Probe X-ray Microanalysis", Microscopy and Microanalysis 5 ... X-Ray Spectrometery in the Scanning Electron Microscope: A Tutorial ...

339

Center for Nanophase Materials Sciences (CNMS) - Publications  

NLE Websites -- All DOE Office Websites (Extended Search)

X. J. Zhang, "Near-Field Scanning Optical Microscopy with Monolithic Silicon Light Emitting Diode on Probe Tip," Appl. Phys. Lett. 92, 131106, (2008). Hoshino, K., L. Rozanski,...

340

CNST Staff Publications  

Science Conference Proceedings (OSTI)

... in Scanning Probe Microscopy for Energy Research, edited by ... for determining exfoliation energies of lamellar ... Journal Web Site; Optimization of spin ...

2013-08-27T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


341

Public Safety and Security in Analytical Microscopy Group  

Science Conference Proceedings (OSTI)

Public Safety and Security in Analytical Microscopy Group. Summary: Reliable standards are needed to test, maintain, and ...

2012-10-02T23:59:59.000Z

342

Depth Charge: Using Atomic Force Microscopy to Study ...  

Science Conference Proceedings (OSTI)

... right circumstances, surface science instruments such ... Electric force microscopy can be used to ... superior strength and electrical conductance, added ...

2010-10-05T23:59:59.000Z

343

Electron and X-Ray Microscopy: Structural Characterization of ...  

Science Conference Proceedings (OSTI)

Oct 28, 2009 ... Recent Advances in Structural Characterization of Materials: Electron and X-Ray Microscopy: Structural Characterization of Nanoscale ...

344

Opportunities for Multimodal CARS Microscopy in Materials Science  

Science Conference Proceedings (OSTI)

Symposium, Optical and X-ray Imaging Techniques for Material Characterization. Presentation Title, Opportunities for Multimodal CARS Microscopy in Materials ...

345

Comparison of Segmentation Algorithms For Fluorescence Microscopy Images of Cells  

E-Print Network (OSTI)

Comparison of Segmentation Algorithms For Fluorescence Microscopy Images of Cells Alden A. Dima,1 Mary C. Brady,1 Hai C. Tang,1 Anne L. Plant2 * Abstract The analysis of fluorescence microscopy fluorescence microscopy; k-means cluster; image segmentation; cell edge; bivariate simi- larity index NUMEROUS

Bernal, Javier

346

Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint  

DOE Green Energy (OSTI)

Internal interfaces are critical in determining the performance of III-V multijunction solar cells. Studying these interfaces with atomic resolution using a combination of transmission electron microscopy (TEM), atom probe tomography (APT), and density functional calculations enables a more fundamental understanding of carrier dynamics in photovoltaic (PV) device structures. To achieve full atomic scale spatial and chemical resolution, data acquisition parameters in laser pulsed APT must be carefully studied to eliminate surface diffusion. Atom probe data with minimized group V ion clustering and expected stoichiometry can be achieved by adjusting laser pulse power, pulse repetition rate, and specimen preparation parameters such that heat flow away from the evaporating surface is maximized. Applying these improved analysis conditions to III-V based PV gives an atomic scale understanding of compositional and dopant profiles across interfaces and tunnel junctions and the initial stages of alloy clustering and dopant accumulation. Details on APT experimental methods and future in-situ instrumentation developments are illustrated.

Gorman, B. P.; Guthrey, H.; Norman, A. G.; Al-Jassim, M.; Lawrence, D.; Prosa, T.

2011-07-01T23:59:59.000Z

347

Imaging doped silicon test structures using low energy electron microscopy.  

SciTech Connect

This document is the final SAND Report for the LDRD Project 105877 - 'Novel Diagnostic for Advanced Measurements of Semiconductor Devices Exposed to Adverse Environments' - funded through the Nanoscience to Microsystems investment area. Along with the continuous decrease in the feature size of semiconductor device structures comes a growing need for inspection tools with high spatial resolution and high sample throughput. Ideally, such tools should be able to characterize both the surface morphology and local conductivity associated with the structures. The imaging capabilities and wide availability of scanning electron microscopes (SEMs) make them an obvious choice for imaging device structures. Dopant contrast from pn junctions using secondary electrons in the SEM was first reported in 1967 and more recently starting in the mid-1990s. However, the serial acquisition process associated with scanning techniques places limits on the sample throughput. Significantly improved throughput is possible with the use of a parallel imaging scheme such as that found in photoelectron emission microscopy (PEEM) and low energy electron microscopy (LEEM). The application of PEEM and LEEM to device structures relies on contrast mechanisms that distinguish differences in dopant type and concentration. Interestingly, one of the first applications of PEEM was a study of the doping of semiconductors, which showed that the PEEM contrast was very sensitive to the doping level and that dopant concentrations as low as 10{sup 16} cm{sup -3} could be detected. More recent PEEM investigations of Schottky contacts were reported in the late 1990s by Giesen et al., followed by a series of papers in the early 2000s addressing doping contrast in PEEM by Ballarotto and co-workers and Frank and co-workers. In contrast to PEEM, comparatively little has been done to identify contrast mechanisms and assess the capabilities of LEEM for imaging semiconductor device strictures. The one exception is the work of Mankos et al., who evaluated the impact of high-throughput requirements on the LEEM designs and demonstrated new applications of imaging modes with a tilted electron beam. To assess its potential as a semiconductor device imaging tool and to identify contrast mechanisms, we used LEEM to investigate doped Si test structures. In section 2, Imaging Oxide-Covered Doped Si Structures Using LEEM, we show that the LEEM technique is able to provide reasonably high contrast images across lateral pn junctions. The observed contrast is attributed to a work function difference ({Delta}{phi}) between the p- and n-type regions. However, because the doped regions were buried under a thermal oxide ({approx}3.5 nm thick), e-beam charging during imaging prevented quantitative measurements of {Delta}{phi}. As part of this project, we also investigated a series of similar test structures in which the thermal oxide was removed by a chemical etch. With the oxide removed, we obtained intensity-versus-voltage (I-V) curves through the transition from mirror to LEEM mode and determined the relative positions of the vacuum cutoffs for the differently doped regions. Although the details are not discussed in this report, the relative position in voltage of the vacuum cutoffs are a direct measure of the work function difference ({Delta}{phi}) between the p- and n-doped regions.

Nakakura, Craig Yoshimi; Anderson, Meredith Lynn; Kellogg, Gary Lee

2010-01-01T23:59:59.000Z

348

2-M Probe Survey | Open Energy Information  

Open Energy Info (EERE)

2-M Probe Survey 2-M Probe Survey (Redirected from 2-M Probe) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Technique: 2-M Probe Survey Details Activities (27) Areas (21) Regions (0) NEPA(3) Exploration Technique Information Exploration Group: Field Techniques Exploration Sub Group: Data Collection and Mapping Parent Exploration Technique: Data Collection and Mapping Information Provided by Technique Lithology: Stratigraphic/Structural: Hydrological: Thermal: Identify and delineate shallow thermal anomalies Cost Information Low-End Estimate (USD): 200.0020,000 centUSD 0.2 kUSD 2.0e-4 MUSD 2.0e-7 TUSD / station Median Estimate (USD): 300.0030,000 centUSD 0.3 kUSD 3.0e-4 MUSD 3.0e-7 TUSD / station High-End Estimate (USD): 500.0050,000 centUSD 0.5 kUSD 5.0e-4 MUSD

349

Buried Interface Analysis Using Atom Probe Tomography  

Science Conference Proceedings (OSTI)

Contributions of Atom Probe Tomography to the Understanding of Steels · Control of p-n ... Relationships in a Series of Co-Cr-Cu-Fe-Ni-Al High Entropy Alloys.

350

Atom Probe Tomography for Industrial Applications - Programmaster ...  

Science Conference Proceedings (OSTI)

Contributions of Atom Probe Tomography to the Understanding of Steels · Control of p-n ... Relationships in a Series of Co-Cr-Cu-Fe-Ni-Al High Entropy Alloys.

351

Remote Adjustable focus Raman Spectroscopy Probe  

DOE Patents (OSTI)

A remote adjustable focus Raman spectroscopy probe allows for analyzing Raman scattered light from a point of interest external to the probe. An environmental barrier including at least one window separates the probe from the point of interest. An optical tube is disposed adjacent to the environmental barrier and includes along working length compound lens objective next to the window. A beam splitter and a mirror are at the other end. A mechanical means is used to translate the probe body in the X, Y, and Z directions resulting in a variable focus optical apparatus. Laser light is reflected by the beam splitter and directed toward the compound lens objective, then through the window and focused on the point of interest. Raman scattered light is then collected by the compound lens objective and directed through the beam splitter to a mirror. A device for analyzing the light, such as a monochrometer, is coupled to the mirror.

Schmucker, John E.; Blasi, Raymond J.; Archer, William B.

1998-07-28T23:59:59.000Z

352

Probes of strong-field gravity  

E-Print Network (OSTI)

In this thesis, I investigate several ways to probe gravity in the strong-field regime. These investigations focus on observables from the gravitational dynamics, i.e. when time derivatives are large: thus I focus on sources ...

Stein, Leo Chaim

2012-01-01T23:59:59.000Z

353

Self-referencing remote optical probe  

DOE Patents (OSTI)

A probe for remote spectrometric measurements of fluid samples having a hollow probe body with a sliding reflective plug therein and a lens at one end, ports for admitting and expelling the fluid sample and a means for moving the reflector so that reference measurement can be made with the reflector in a first position near the lens and a sample measurement can be made with the reflector away from the lens and the fluid sample between the reflector and the lens. Comparison of the two measurements will yield the composition of the fluid sample. The probe is preferably used for remote measurements and light is carried to and from the probe via fiber optic cables. 3 figs.

O' Rourke, P.E.; Prather, W.S.; Livingston, R.R.

1990-02-12T23:59:59.000Z

354

Self-referencing remote optical probe  

DOE Patents (OSTI)

A probe is described for remote spectrometric measurements of fluid samples having a hollow probe body with a sliding reflective plug therein and a lens at one end, ports for admitting and expelling the fluid sample and a means for moving the reflector so that reference measurement can be made with the reflector in a first position near the lens and a sample measurement can be made with the reflector away from the lens and the fluid sample between the reflector and the lens. Comparison of the two measurements will yield the composition of the fluid sample. The probe is preferably used for remote measurements and light is carried to and from the probe via fiber optic cables. 3 figures.

O' Rourke, P.E.; Prather, W.S.; Livingston, R.R.

1991-08-13T23:59:59.000Z

355

Surface sampling concentration and reaction probe  

DOE Patents (OSTI)

A method of analyzing a chemical composition of a specimen is described. The method can include providing a probe comprising an outer capillary tube and an inner capillary tube disposed co-axially within the outer capillary tube, where the inner and outer capillary tubes define a solvent capillary and a sampling capillary in fluid communication with one another at a distal end of the probe; contacting a target site on a surface of a specimen with a solvent in fluid communication with the probe; maintaining a plug volume proximate a solvent-specimen interface, wherein the plug volume is in fluid communication with the probe; draining plug sampling fluid from the plug volume through the sampling capillary; and analyzing a chemical composition of the plug sampling fluid with an analytical instrument. A system for performing the method is also described.

Van Berkel, Gary J; Elnaggar, Mariam S

2013-07-16T23:59:59.000Z

356

Circular zig-zag scan video format  

DOE Patents (OSTI)

This invention is comprised of a circular, zig-zag scan for use with vidicon tubes. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal.

Peterson, C.G.; Simmons, C.M.

1991-03-21T23:59:59.000Z

357

Circular zig-zag scan video format  

DOE Patents (OSTI)

A circular, ziz-zag scan for use with vidicon tubes is disclosed. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal. 10 figs.

Peterson, C.G.; Simmons, C.M.

1992-06-09T23:59:59.000Z

358

Fiber optic probe for light scattering measurements  

DOE Patents (OSTI)

A fiber optic probe and a method for using the probe for light scattering analyses of a sample. The probe includes a probe body with an inlet for admitting a sample into an interior sample chamber, a first optical fiber for transmitting light from a source into the chamber, and a second optical fiber for transmitting light to a detector such as a spectrophotometer. The interior surface of the probe carries a coating that substantially prevents non-scattered light from reaching the second fiber. The probe is placed in a region where the presence and concentration of an analyte of interest are to be detected, and a sample is admitted into the chamber. Exciting light is transmitted into the sample chamber by the first fiber, where the light interacts with the sample to produce Raman-scattered light. At least some of the Raman-scattered light is received by the second fiber and transmitted to the detector for analysis. Two Raman spectra are measured, at different pressures. The first spectrum is subtracted from the second to remove background effects, and the resulting sample Raman spectrum is compared to a set of stored library spectra to determine the presence and concentration of the analyte.

Nave, Stanley E. (Evans, GA); Livingston, Ronald R. (Aiken, SC); Prather, William S. (Augusta, GA)

1995-01-01T23:59:59.000Z

359

Fiber optic probe for light scattering measurements  

DOE Patents (OSTI)

This invention is comprised of a fiber optic probe and a method for using the probe for light scattering analyses of a sample. The probe includes a probe body with an inlet for admitting a sample into an interior sample chamber, a first optical fiber for transmitting light from a source into the chamber, and a second optical fiber for transmitting light to a detector such as a spectrophotometer. The interior surface of the probe carries a coating that substantially prevents non-scattered light from reaching the second fiber. The probe is placed in a region where the presence and concentration of an analyte of interest are to be detected, and a sample is admitted into the chamber. Exciting light is transmitted into the sample chamber by the first fiber, where the light interacts with the sample to produce Raman-scattered light. At least some of the Raman- scattered light is received by the second fiber and transmitted to the detector for analysis. Two Raman spectra are measured, at different pressures. The first spectrum is subtracted from the second to remove background effects, and the resulting sample Raman spectrum is compared to a set of stored library spectra to determine the presence and concentration of the analyte.

Nave, S.E.; Livingston, R.R.; Prather, W.S.

1993-01-01T23:59:59.000Z

360

A facile electron microscopy method for measuring precipitate volume fractions in AlCuMg alloys  

SciTech Connect

Precipitate volume fraction is an important parameter to estimate the strength of precipitation-hardened metals. In this study, a facile method was applied to measure the precipitate volume fractions in an age-hardened AlCuMg alloy. In this method, the precipitate volume fraction values can be obtained by multiplying the volume precipitate number densities with the averaged precipitate volumes, which can be easily measured in scanning electron microscopy and transmission electron microscopy, respectively. Compared with the conventional method, in which the specimen thickness has to be measured in transmission electron microscopy, the method proposed in this study is more facile to perform. - Highlights: Black-Right-Pointing-Pointer We have proposed a facile method to measure precipitate volume fractions for precipitation-hardened metals. Black-Right-Pointing-Pointer This technique works well for the square-shaped {theta} Prime -phase nano-precipitates in 2xxx aluminum alloys. Black-Right-Pointing-Pointer Interesting is that the proposed method is easy for materials scientists and engineers to perform.

Zhao, X.Q.; Shi, M.J.; Chen, J.H., E-mail: jhchen123@hnu.edu.cn; Wang, S.B.; Liu, C.H.; Wu, C.L.

2012-07-15T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


361

Soft x-ray microanalysis and microscopy: A unique probe of the organic chemistry of heterogeneous solids  

SciTech Connect

STXM and C-NEXAFS (carbon near edge absorption micro-spectroscopy) microanalysis were used to analysis the microchemistry of cokes and highly carbonaceous materials. The issue of molecular orientation is addressed by using the intrinsic polarization of the x-ray beam at X1A beamline at NSLS.

Cody, G.D.; Botto, R.E. [Argonne National Lab., IL (United States); Ade, H. [North Carolina State Univ., Raleigh, NC (United States). Dept. of Physics; Wirick, S. [SUNY at Stony Brook, NY (United States). Dept. of Physics; Davis, A.; Mitchell, G. [Pennsylvania State Univ., University Park, PA (United States). Coal and Organic Petrology Labs.

1995-08-01T23:59:59.000Z

362

Probing Nanostructures for Photovoltaics: Using atomic force microscopy and other tools to characterize nanoscale materials for harvesting solar energy  

E-Print Network (OSTI)

a PEDOT:PSS coated indium tin oxide (ITO) anode and LiF/Althe e?ciency. Indium tin oxide (ITO) is a transparentIn the control device, indium tin oxide(ITO) is used as the

Zaniewski, Anna Monro

2012-01-01T23:59:59.000Z

363

Probing Nanostructures for Photovoltaics: Using atomic force microscopy and other tools to characterize nanoscale materials for harvesting solar energy  

E-Print Network (OSTI)

Spectroscopy of single CdSe nanocrystallites. Accts. Chem.of individual CdSe/CdS core/shell nanocrystals on siliconmicroscopy study of single Au-CdSe hybrid nanodumbbells:

Zaniewski, Anna Monro

2012-01-01T23:59:59.000Z

364

NCEM National Center for Electron Microscopy: Staff  

NLE Websites -- All DOE Office Websites (Extended Search)

Staff Staff Scientific Technical / Admin. Postdoctoral and Visitors Uli Dahmen, Head Jane Cavlina / Administrator Abhay Gautam Christian Kisielowski John Turner Helmut Poppa Andrew Minor ChengYu Song Frances Allen Andreas Schmid Marissa Libbee Tamara Radetic Peter Ercius Karen Bustillo Haimei Zheng Jim Ciston Alpha N'Diaye Colin Ophus Gong Chen Burak Ozdol Velimir Radmilovic Sara Kiani Hua Guo Christian Liebscher Josh Kacher Chris Nelson Xiuguang Jin Qian Yu Mary Scott Search the LBNL directory services page for other LBNL staff. Scientific Staff Uli Dahmen udahmen@lbl.gov (510) 486-4627 Ulrich Dahmen is Director of the National Center for Electron Microscopy. His current research interests include embedded nanostructures and interfaces in materials. Embedded nanostructures. Size- and shape-dependence of structural phase

365

Vibrations of the "beetle" scanning probe microscope: Identification of a new mode, generalized analysis, and characterization methodology  

E-Print Network (OSTI)

depolarization field in global coordinates due to the presence of surface charges can be approxi- mated as Ei;depol 2 Ei;depolPi. Ă°17Ă? Finally, when an externally electric field Ei,appel is ap- plied in the global

Carpick, Robert W.

366

Lollipops and Ice Fishing: Molecular Rulers Used to Probe ...  

Science Conference Proceedings (OSTI)

Lollipops and Ice Fishing: Molecular Rulers Used to Probe Nanopores. For Immediate Release: April 27, 2010. ...

2011-10-03T23:59:59.000Z

367

A System Level Boundary Scan Controller Board for VME Applications  

Science Conference Proceedings (OSTI)

In this article an application of boundary scan test at system level is analyzed. The objective is met through the description of the design and implementation options of a VME boundary scan controller board prototype and the corresponding software. ... Keywords: ATPG, IEEE 1149.1 boundary scan test, board level test and system level test

Nuno Cardoso; Carlos Beltrán Almeida; José Carlos Da Silva

2001-06-01T23:59:59.000Z

368

Phase contrast in high resolution electron microscopy  

DOE Patents (OSTI)

This patent relates to a device for developing a phase contrast signal for a scanning transmission electron microscope. The lens system of the microscope is operated in a condition of defocus so that predictable alternate concentric regions of high and low electron density exist in the cone of illumination. Two phase detectors are placed beneath the object inside the cone of illumination, with the first detector having the form of a zone plate, each of its rings covering alternate regions of either higher or lower electron density. The second detector is so configured that it covers the regions of electron density not covered by the first detector. Each detector measures the number of electrons incident thereon and the signal developed by the first detector is subtracted from the signal developed by the record detector to provide a phase contrast signal. (auth)

Rose, H.H.

1975-09-23T23:59:59.000Z

369

Development of symmetry-resolved zero-kinetic-energy photoelectron spectroscopy for probing multielectron processes  

Science Conference Proceedings (OSTI)

A new experimental setup for probing multielectron processes in molecular inner-shell ionization regions has been developed. Symmetry-resolved zero-kinetic-energy (ZEKE) spectra have been measured by scanning the photon energy along with monitoring the intensity of the coincidence signals between ZEKE electrons and fragment ions detected at 0 deg. and 90 deg. relative to the electric vector of the light. The actual performance of the method is illustrated by using it to reveal the symmetry decomposition of the multielectron processes, such as double excitations and shake-up satellites, in the K-shell ionization region of nitrogen.

Gejo, T.; Nakamura, E.; Shigemasa, E. [UVSOR Facility, Institute for Molecular Science, Okazaki 444-8585 (Japan)

2006-03-15T23:59:59.000Z

370

Copy of Bound Original For Scanning  

Office of Legacy Management (LM)

Copy of Bound Original Copy of Bound Original For Scanning Document # 1\1\ i g -b DOE/El/-0005/6 Formerly Utilized IVIEWAEC Site! Remedial Action Progrhn, F@diilogical Survey of the Seaway Industrial Par Tonawanda, New Yor May 197 Final Repel Prepared f U.S. Department of Enerc Assistant Secretary for Environme Division of Environmental Control Technolo Washington, D.C. 205, uric Contract No. W-7405-ENG- - - - Available from: ' : -. National Technical Information Service (NTIS) U.S. Department of Comnerce 5285 Port Royal Road Springfield, Virginia 22161 price: Printed Copy: $ 5.25 Microffche: $ 3.00 PREFACE This series of reports results from a program initiated in 1974 by the Atomic Energy Commission (AEC) for determination of the condition of sites formerly utilized by the Manhattan Engineering District &ED)

371

Results from STAR Beam Energy Scan Program  

E-Print Network (OSTI)

Results from the Beam Energy Scan (BES) program conducted recently by STAR experiment at RHIC are presented. The data from Phase-I of the BES program collected in Au+Au collisions at center-of-mass energies (\\sqrt{s_{NN}}) of 7.7, 11.5, 19.6, 27, and 39 GeV cover a wide range of baryon chemical potential ?\\mu_B (100-400 MeV) in the QCD phase diagram. Several STAR results from the BES Phase-I related to "turn-o?ff" of strongly inter- acting quark-gluon plasma (sQGP) signatures and signals of QCD phase boundary are reported. In addition to this, an outlook is presented for the future BES Phase-II program and a possible ?fixed target program at STAR.

Michal Sumbera

2013-01-30T23:59:59.000Z

372

Rapid scanning system for fuel drawers  

DOE Patents (OSTI)

A nondestructive method for uniqely distinguishing among and quantifying the mass of individual fuel plates in situ in fuel drawers utilized in nuclear reactors is described. The method is both rapid and passive, eliminating the personnel hazard of the commonly used irradiation techniques which require that the analysis be performed in proximity to an intense neutron source such as a reactor. In the present technique, only normally decaying nuclei are observed. This allows the analysis to be performed anywhere. This feature, combined with rapid scanning of a given fuel drawer (in approximately 30 s), and the computer data analysis allows the processing of large numbers of fuel drawers efficiently in the event of a loss alert.

Caldwell, John T. (Los Alamos, NM); Fehlau, Paul E. (Los Alamos, NM); France, Stephen W. (Los Alamos, NM)

1981-01-01T23:59:59.000Z

373

Systematic Sampling of Scanning Lidar Swaths  

E-Print Network (OSTI)

Proof of concept lidar research has, to date, examined wall-to-wall models of forest ecosystems. While these studies have been important for verifying lidars efficacy for forest surveys, complete coverage is likely not the most cost effective means of using lidar as auxiliary data for operational surveys; sampling of some sort being the better alternative. This study examines the effectiveness of sampling with high point-density scanning lidar data and shows that systematic sampling is a better alternative to simple random sampling. It examines the bias and mean squared error of various estimators, and concludes that a linear-trend-based and especially an autocorrelation-assisted variance estimator perform better than the commonly used simple random sampling based-estimator when sampling is systematic.

Marcell, Wesley Tyler

2009-12-01T23:59:59.000Z

374

Microscopic Analysis of Corn Fiber Using Corn Starch- and Cellulose-Specific Molecular Probes  

Science Conference Proceedings (OSTI)

Ethanol is the primary liquid transportation fuel produced from renewable feedstocks in the United States today. The majority of corn grain, the primary feedstock for ethanol production, has been historically processed in wet mills yielding products such as gluten feed, gluten meal, starch, and germ. Starch extracted from the grain is used to produce ethanol in saccharification and fermentation steps; however the extraction of starch is not 100% efficient. To better understand starch extraction during the wet milling process, we have developed fluorescent probes that can be used to visually localize starch and cellulose in samples using confocal microscopy. These probes are based on the binding specificities of two types of carbohydrate binding modules (CBMs), which are small substrate-specific protein domains derived from carbohydrate degrading enzymes. CBMs were fused, using molecular cloning techniques, to a green fluorescent protein (GFP) or to the red fluorescent protein DsRed (RFP). Using these engineered probes, we found that the binding of the starch-specific probe correlates with starch content in corn fiber samples. We also demonstrate that there is starch internally localized in the endosperm that may contribute to the high starch content in corn fiber. We also surprisingly found that the cellulose-specific probe did not bind to most corn fiber samples, but only to corn fiber that had been hydrolyzed using a thermochemical process that removes the residual starch and much of the hemicellulose. Our findings should be of interest to those working to increase the efficiency of the corn grain to ethanol process.

Porter, S. E.; Donohoe, B. S.; Beery, K. E.; Xu, Q.; Ding, S.-Y.; Vinzant, T. B.; Abbas, C. A.; Himmel, M. E.

2007-09-01T23:59:59.000Z

375

Lightning strokes can probe the ionosphere  

NLE Websites -- All DOE Office Websites (Extended Search)

Lightning Strokes Can Probe Ionosphere Lightning Strokes Can Probe Ionosphere Lightning strokes can probe the ionosphere Researchers have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. April 11, 2013 Lightning. Credit: National Oceanic and Atmospheric Administration (NOAA) The team found that the electron density in the lower ionosphere decreased in response to lightning discharges. Thunderstorms, and the resulting partially ionized plasma of the ionosphere, can distort radio signals traveling to satellites important to communications, navigation or national security Los Alamos researchers and a collaborator have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. This study supports one theory for how tropospheric

376

Probing Organic Transistors with Infrared Beams  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Organic Transistors with Infrared Beams Print Probing Organic Transistors with Infrared Beams Print Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is growing need for the development of electronic devices based on organic polymer materials. Organic field-effect transistors (FETs) are ideal for special applications that require large areas, light weight, and structural flexibility. They also have the advantage of being easy to mass-produce at very low cost. However, even though this class of devices is finding a growing number of applications, electronic processes in organic materials are still not well understood. A group of researchers from the University of California and the ALS has succeeded in probing the intrinsic electronic properties of the charge carriers in organic FETs using infrared spectromicroscopy. The results of their study could help in the future development of sensors, large-area displays, and other plastic electronic components.

377

Lightning strokes can probe the ionosphere  

NLE Websites -- All DOE Office Websites (Extended Search)

Lightning Strokes Can Probe Ionosphere Lightning Strokes Can Probe Ionosphere Lightning strokes can probe the ionosphere Researchers have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. April 11, 2013 Lightning. Credit: National Oceanic and Atmospheric Administration (NOAA) The team found that the electron density in the lower ionosphere decreased in response to lightning discharges. Thunderstorms, and the resulting partially ionized plasma of the ionosphere, can distort radio signals traveling to satellites important to communications, navigation or national security Los Alamos researchers and a collaborator have made measurements during thunderstorms to study the affect of lightning on the lower ionosphere and radiofrequency signals. This study supports one theory for how tropospheric

378

Remote adjustable focus Raman spectroscopy probe  

DOE Patents (OSTI)

A remote adjustable focus Raman spectroscopy probe allows for analyzing Raman scattered light from a point of interest external probe. An environmental barrier including at least one window separates the probe from the point of interest. An optical tube is disposed adjacent to the environmental barrier and includes a long working length compound lens objective next to the window. A beam splitter and a mirror are at the other end. A mechanical means is used to translated the prove body in the X, Y, and Z directions resulting in a variable focus optical apparatus. Laser light is reflected by the beam splitter and directed toward the compound lens objective, then through the window and focused on the point of interest. Raman scattered light is then collected by the compound lens objective and directed through the beam splitter to a mirror. A device for analyzing the light, such as a monochrometer, is coupled to the mirror.

Schmucker, John E. (Hurt, VA); Blasi, Raymond J. (Harrison City, PA); Archer, William B. (Bethel Park, PA)

1999-01-01T23:59:59.000Z

379

Gamma-ray blind beta particle probe  

DOE Patents (OSTI)

An intra-operative beta particle probe is provided by placing a suitable photomultiplier tube (PMT), micro channel plate (MCP) or other electron multiplier device within a vacuum housing equipped with: 1) an appropriate beta particle permeable window; and 2) electron detection circuitry. Beta particles emitted in the immediate vicinity of the probe window will be received by the electron multiplier device and amplified to produce a detectable signal. Such a device is useful as a gamma insensitive, intra-operative, beta particle probe in surgeries where the patient has been injected with a beta emitting radiopharmaceutical. The method of use of such a device is also described, as is a position sensitive such device.

Weisenberger, Andrew G. (Grafton, VA)

2001-01-01T23:59:59.000Z

380

2-M Probe Survey | Open Energy Information  

Open Energy Info (EERE)

2-M Probe Survey 2-M Probe Survey Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Technique: 2-M Probe Survey Details Activities (27) Areas (21) Regions (0) NEPA(3) Exploration Technique Information Exploration Group: Field Techniques Exploration Sub Group: Data Collection and Mapping Parent Exploration Technique: Data Collection and Mapping Information Provided by Technique Lithology: Stratigraphic/Structural: Hydrological: Thermal: Identify and delineate shallow thermal anomalies Cost Information Low-End Estimate (USD): 200.0020,000 centUSD 0.2 kUSD 2.0e-4 MUSD 2.0e-7 TUSD / station Median Estimate (USD): 300.0030,000 centUSD 0.3 kUSD 3.0e-4 MUSD 3.0e-7 TUSD / station High-End Estimate (USD): 500.0050,000 centUSD 0.5 kUSD 5.0e-4 MUSD 5.0e-7 TUSD / station

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


381

Study of radiation effects on the cell structure and evaluation of the dose delivered by x-ray and {alpha}-particles microscopy  

SciTech Connect

Hard X-ray fluorescence microscopy and magnified phase contrast imaging are combined to study radiation effects on cells. Experiments were performed on freeze-dried cells at the nano-imaging station ID22NI of the European synchrotron radiation facility. Quantitative phase contrast imaging provides maps of the projected mass and is used to evaluate the structural changes due to irradiation during X-ray fluorescence experiments. Complementary to phase contrast imaging, scanning transmission ion microscopy is performed and doses of all the experiments are compared. We demonstrate the sensitivity of the proposed approach to study radiation-induced damage at the sub-cellular level.

Kosior, Ewelina; Cloetens, Peter [European Synchrotron Radiation Facility, F-38000 Grenoble (France); Deves, Guillaume; Ortega, Richard [Univ. Bordeaux, CENBG, UMR 5797, F-33170 Gradignan (France); CNRS, IN2P3, CENBG, UMR 5797, F-33170 Gradignan (France); Bohic, Sylvain [European Synchrotron Radiation Facility, 38000 Grenoble (France); INSERM U-836 (Team 6: Synchrotron Radiation and Medical Research), Grenoble Institut of Neuroscience, F-38000 Grenoble (France)

2012-12-24T23:59:59.000Z

382

Scintillation probe with photomultiplier tube saturation indicator  

SciTech Connect

A photomultiplier tube saturation indicator is formed by supplying a supplemental light source, typically an light emitting diode (LED), adjacent to the photomultiplier tube. A switch allows the light source to be activated. The light is forwarded to the photomultiplier tube by an optical fiber. If the probe is properly light tight, then a meter attached to the indicator will register the light from the LED. If the probe is no longer light tight, and the saturation indicator is saturated, no signal will be registered when the LED is activated. 2 figs.

Ruch, J.F.; Urban, D.J.

1996-10-01T23:59:59.000Z

383

Scintillation probe with photomultiplier tube saturation indicator  

DOE Patents (OSTI)

A photomultiplier tube saturation indicator is formed by supplying a supplemental light source, typically an light emitting diode (LED), adjacent to the photomultiplier tube. A switch allows the light source to be activated. The light is forwarded to the photomultiplier tube by an optical fiber. If the probe is properly light tight, then a meter attached to the indicator will register the light from the LED. If the probe is no longer light tight, and the saturation indicator is saturated, no signal will be registered when the LED is activated.

Ruch, Jeffrey F. (Bethel Park, PA); Urban, David J. (Glassport, PA)

1996-01-01T23:59:59.000Z

384

A flow cell for electron microscopy imaging of specimen in ...  

A flow cell for electron microscopy imaging of specimen in liquid or gas. Note: The technology described above is an early stage opportunity. ...

385

Ultrasonic-Based Mode-Synthesizing Atomic Force Microscopy  

In a single run and without damaging the sample, ORNL’s mode-synthesizingatomic force microscopy (MSAFM), along with mode-synthesizing sensing, ...

386

NCEM National Center for Electron Microscopy: NCEM Fellowship  

NLE Websites -- All DOE Office Websites (Extended Search)

Visiting Scientist Program Visiting Scientist Program The National Center for Electron Microscopy (NCEM) offers a program that gives participants the opportunity to conduct...

387

NCEM National Center for Electron Microscopy: Workshops and Seminars  

NLE Websites -- All DOE Office Websites (Extended Search)

Upcoming Seminars Thursday, October 3, 2013 at 11am Matthew Mecklenburg Center for Electron Microscopy and MicroAnalysis, University of Southern California 2D crystals are...

388

Optical Microscopy and Spectroscopy for Material Characterization II  

Science Conference Proceedings (OSTI)

Oct 30, 2013 ... By measuring the phase of the SHG, it provides information about the relative ... We combined interferometry to SHG microscopy to retrieve the ...

389

Characterization of Battery Cycling by In-Situ Microscopy  

Science Conference Proceedings (OSTI)

Presentation Title, Characterization of Battery Cycling by In-Situ Microscopy ... of lithium ion batteries provides an important route to reducing the lifetime costs of ...

390

High Energy Diffraction Microscopy at the Advanced Photon Source ...  

Science Conference Proceedings (OSTI)

The APS 1-ID beamline is dedicated to high-energy diffraction and the status of the ... High Energy Diffraction Microscopy at the Advanced Photon Source 1-ID ...

391

In Situ Transmission Electron Microscopy Studies of Size  

Science Conference Proceedings (OSTI)

Using in situ transmission electron microscopy (TEM) nanocompression testing, we ... Ab Initio DFT Modeling of the Dislocation and Its Mobility in TiN Ceramic.

392

In Situ Aberration-Corrected Scanning Transmission Electron ...  

Science Conference Proceedings (OSTI)

Using real-time transmission electron microscopy (TEM) at atomic resolutions should shed light into some of the fundamental questions in this field.

393

Lansce Wire Scanning Diagnostics Device Mechanical Design  

SciTech Connect

The Accelerator Operations & Technology Division at Los Alamos National Laboratory operates a linear particle accelerator which utilizes 110 wire scanning diagnostics devices to gain position and intensity information of the proton beam. In the upcoming LANSCE improvements, 51 of these wire scanners are to be replaced with a new design, up-to-date technology and off-the-shelf components. This document outlines the requirements for the mechanical design of the LANSCE wire scanner and presents the recently developed linac wire scanner prototype. Additionally, this document presents the design modifications that have been implemented into the fabrication and assembly of this first linac wire scanner prototype. Also, this document will present the design for the second, third, and fourth wire scanner prototypes being developed. Prototypes 2 and 3 belong to a different section of the particle accelerator and therefore have slightly different design specifications. Prototype 4 is a modification of a previously used wire scanner in our facility. Lastly, the paper concludes with a plan for future work on the wire scanner development.

Rodriguez Esparza, Sergio [Los Alamos National Laboratory; Batygin, Yuri K. [Los Alamos National Laboratory; Gilpatrick, John D. [Los Alamos National Laboratory; Gruchalla, Michael E. [Los Alamos National Laboratory; Maestas, Alfred J. [Los Alamos National Laboratory; Pillai, Chandra [Los Alamos National Laboratory; Raybun, Joseph L. [Los Alamos National Laboratory; Sattler, F. D. [Los Alamos National Laboratory; Sedillo, James Daniel [Los Alamos National Laboratory; Smith, Brian G. [Los Alamos National Laboratory

2011-01-01T23:59:59.000Z

394

Positron Emission Tomography (PET) and Positron Scanning  

Office of Scientific and Technical Information (OSTI)

DOE R&D Accomplishments DOE R&D Accomplishments Search All Database Web Pages for Go The Basics Home About What's New FAQ Contact Us Laureates Nobel Laureates Fermi Laureates Nobel Physicists Nobel Chemists Medicine Nobels Explore Insights SC Stories Snapshots R&D Nuggets Database Search Browse Reports Database Help Finding Aids Site Map A - Z Index Menu Synopsis Blog Archive QR Code RSS Archive Tag Cloud Videos Widget XML Bookmark and Share Positron Emission Tomography (PET) and Positron Scanning Resources with Additional Information Positron Emission Tomography (PET) Scanner Courtesy Lawrence Berkeley National Laboratory 'Positron Emission Tomography ... [is a medical imaging technique that] can track chemical reactions in living tissues and merges chemistry with biological imaging. Its strength has been in studies of the brain where there has been significant progress in investigations of drug addiction, aging, mental illness, and neurogenic disorders. Positron Emission Tomography (PET) had its genesis in hot-atom chemical research supported by the Chemical Sciences Division of the Office of Basic Energy Sciences. Through this research it was learned, over many years, how to prepare short-lived positron emitters such as 18F whose half-life is 110 minutes. In 1975, the molecule [18F]fluorodeoxyglucose was successfully synthesized at Brookhaven National Laboratory (BNL) and set the stage for Positron Emission Tomography of the human brain.'

395

Probing Organic Transistors with Infrared Beams  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Organic Transistors with Probing Organic Transistors with Infrared Beams Probing Organic Transistors with Infrared Beams Print Wednesday, 26 July 2006 00:00 Silicon-based transistors are well-understood, basic components of contemporary electronic technology. In contrast, there is growing need for the development of electronic devices based on organic polymer materials. Organic field-effect transistors (FETs) are ideal for special applications that require large areas, light weight, and structural flexibility. They also have the advantage of being easy to mass-produce at very low cost. However, even though this class of devices is finding a growing number of applications, electronic processes in organic materials are still not well understood. A group of researchers from the University of California and the ALS has succeeded in probing the intrinsic electronic properties of the charge carriers in organic FETs using infrared spectromicroscopy. The results of their study could help in the future development of sensors, large-area displays, and other plastic electronic components.

396

EM probes characterisation for security analysis  

Science Conference Proceedings (OSTI)

Along with the vast use of cryptography in security devices came the emergence of attacks like Electro-Magnetic analysis (EMA) where the measurement of the Electro-Magnetic (EM) waves radiated from an integrated circuit are used to extract sensitive ... Keywords: CEMA, correlation analysis, electro-magnetic analysis, probes, side channel information leakage

Benjamin Mounier; Anne-Lise Ribotta; Jacques Fournier; Michel Agoyan; Assia Tria

2012-01-01T23:59:59.000Z

397

Probe and method for DNA detection  

SciTech Connect

A hybridization probe containing two linear strands of DNA lights up upon hybridization to a target DNA using silver nanoclusters that have been templated onto one of the DNA strands. Hybridization induces proximity between the nanoclusters on one strand and an overhang on the other strand, which results in enhanced fluorescence emission from the nanoclusters.

Yeh, Hsin-Chih; Werner, James Henry; Sharma, Jaswinder Kumar; Martinez, Jennifer Suzanne

2013-07-02T23:59:59.000Z

398

Astrophysikalisches Institut Potsdam Probes of Dark Energy  

E-Print Network (OSTI)

Astrophysikalisches Institut Potsdam Probes of Dark Energy using Cosmological Simulations Nonlinear component, called dark energy. This unknown energy causes the expansion of the universe to accelerate theoretical model of dark energy has been developed. Instead a number of models have been proposed that range

399

A Compact Lightweight Aerosol Spectrometer Probe (CLASP)  

Science Conference Proceedings (OSTI)

The Compact Lightweight Aerosol Spectrometer Probe (CLASP) is an optical particle spectrometer capable of measuring size-resolved particle concentrations in 16 user-defined size bins spanning diameters in the range 0.24 < D < 18.5 ?m at a rate of ...

Martin K. Hill; Barbara J. Brooks; Sarah J. Norris; Michael H. Smith; Ian M. Brooks; Gerrit de Leeuw

2008-11-01T23:59:59.000Z

400

V-119: IBM Security AppScan Enterprise Multiple Vulnerabilities |  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

9: IBM Security AppScan Enterprise Multiple Vulnerabilities 9: IBM Security AppScan Enterprise Multiple Vulnerabilities V-119: IBM Security AppScan Enterprise Multiple Vulnerabilities March 26, 2013 - 12:56am Addthis PROBLEM: IBM Security AppScan Enterprise Multiple Vulnerabilities PLATFORM: IBM Rational AppScan 5.x IBM Rational AppScan 8.x ABSTRACT: IBM has acknowledged multiple vulnerabilities REFERENCE LINKS: IBM Reference #:1626264 Secunia Advisory SA52764 CVE-2008-4033 CVE-2012-4431 CVE-2012-5081 CVE-2013-0473 CVE-2013-0474 CVE-2013-0510 CVE-2013-0511 CVE-2013-0512 CVE-2013-0513 CVE-2013-0532 IMPACT ASSESSMENT: Medium DISCUSSION: 1) The application allows users to perform certain actions via HTTP requests without performing proper validity checks to verify the requests. This can be exploited to e.g. cause a DoS when a logged-in user visits a

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


401

Spectral-domain phase microscopy with improved sensitivity using two-dimensional detector arrays  

Science Conference Proceedings (OSTI)

In this work we demonstrate the use of two-dimensional detectors to improve the signal-to-noise ratio (SNR) and sensitivity in spectral-domain phase microscopy for subnanometer accuracy measurements. We show that an increase in SNR can be obtained, from 82 dB to 105 dB, using 150 pixel lines of a low-cost CCD camera as compared to a single line, to compute an averaged axial scan. In optimal mechanical conditions, phase stability as small as 92 {mu}rad, corresponding to 6 pm displacement accuracy, could be obtained. We also experimentally demonstrate the benefit of spatial-averaging in terms of the reduction of signal fading due to an axially moving sample. The applications of the improved system are illustrated by imaging live cells in culture.

Singh, K.; Dion, C.; Ozaki, T. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Institut National de la Recherche Scientifique, Energie, Materiaux et Telecommunications, Varennes, Quebec (Canada); Lesk, M. R. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Departement d'Ophtalmologie, Universite de Montreal, Montreal, Quebec (Canada); Costantino, S. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Departement d'Ophtalmologie, Universite de Montreal, Montreal, Quebec (Canada); Institut de Genie Biomedical, Universite de Montreal, Montreal, Quebec (Canada)

2011-02-15T23:59:59.000Z

402

Determining Mechanical Properties of Carbon Microcoils Using Lateral Force Microscopy  

Science Conference Proceedings (OSTI)

Mechanical properties of amorphous carbon microcoil (CMC) synthesized by thermal chemical vapor deposition method were examined in compression and tension tests, using the lateral force mode of atomic force microscope (AFM). The AFM cantilever tip was ... Keywords: Atomic force microscopy (AFM), atomic force microscopy, carbon microcoil, shear modulus, spring constant

Neng-Kai Chang; Shuo-Hung Chang

2008-03-01T23:59:59.000Z

403

Feasibility and limitation of track studies using atomic force microscopy  

E-Print Network (OSTI)

Feasibility and limitation of track studies using atomic force microscopy D. Nikezic, J.P.Y. Ho, C.W.Y. Yip, V.S.Y. Koo, K.N. Yu * Department of Physics and Materials Science, City University of Hong Kong July 2002 Abstract Atomic force microscopy (AFM) has been employed to investigate characteristics

Yu, K.N.

404

NCEM National Center for Electron Microscopy: Microscopes and...  

NLE Websites -- All DOE Office Websites (Extended Search)

I The TEAM I microscope is a double-aberration-corrected (scanning) transmission electron microscope (STEMTEM) capable of producing images with 50 pm resolution. The basic...

405

Characterization of MOX Fuel Pellets by Photothermal Microscopy  

Science Conference Proceedings (OSTI)

The frequency dependence of such expansion provides information on the thermal ... Scanning the beams allows the retrieval of a map of thermal diffusivity.

406

Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes  

SciTech Connect

A semiconductor nanocrystal compound is described capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source or a particle beam; and (2) at least one linking agent, having a first portion linked to the semiconductor nanocrystal and a second portion capable of linking to an affinity molecule. The compound is linked to an affinity molecule to form a semiconductor nanocrystal probe capable of bonding with a detectable substance. Subsequent exposure to excitation energy will excite the semiconductor nanocrystal in the probe, causing the emission of electromagnetic radiation. Further described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and using the probe to determine the presence of a detectable substance in a material.

Weiss, Shimon (Pinole, CA); Bruchez, Jr., Marcel (Albany, CA); Alivisatos, Paul (Oakland, CA)

2004-03-02T23:59:59.000Z

407

Semiconductor nanocrystal probes for biological applications and process for making and using such probes  

DOE Patents (OSTI)

A semiconductor nanocrystal compound and probe are described. The compound is capable of linking to one or more affinity molecules. The compound comprises (1) one or more semiconductor nanocrystals capable of, in response to exposure to a first energy, providing a second energy, and (2) one or more linking agents, having a first portion linked to the one or more semiconductor nanocrystals and a second portion capable of linking to one or more affinity molecules. One or more semiconductor nanocrystal compounds are linked to one or more affinity molecules to form a semiconductor nanocrystal probe capable of bonding with one or more detectable substances in a material being analyzed, and capable of, in response to exposure to a first energy, providing a second energy. Also described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and treating materials with the probe.

Weiss, Shimon (Pinole, CA); Bruchez, Marcel (Newark, CA); Alivisatos, Paul (Oakland, CA)

2011-12-06T23:59:59.000Z

408

Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes  

DOE Patents (OSTI)

A semiconductor nanocrystal compound is described capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source or a particle beam; and (2) at least one linking agent, having a first portion linked to the semiconductor nanocrystal and a second portion capable of linking to an affity molecule. The compound is linked to an affinity molecule to form a semiconductor nanocrystal probe capable of bonding with a detectable substance. Subsequent exposure to excitation energy will excite the semiconductor nanocrystal in he probe, causing the emission of electromagnetic radiation. Further described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and using the probe to determine the presence of a detectable substance in a material.

Weiss, Shimon (Pinole, CA); Bruchez, Jr., Marcel (Albany, CA); Alivisatos, Paul (Oakland, CA)

2002-01-01T23:59:59.000Z

409

Semiconductor nanocrystal probes for biological applications and process for making and using such probes  

SciTech Connect

A semiconductor nanocrystal compound and probe are described. The compound is capable of linking to one or more affinity molecules. The compound comprises (1) one or more semiconductor nanocrystals capable of, in response to exposure to a first energy, providing a second energy, and (2) one or more linking agents, having a first portion linked to the one or more semiconductor nanocrystals and a second portion capable of linking to one or more affinity molecules. One or more semiconductor nanocrystal compounds are linked to one or more affinity molecules to form a semiconductor nanocrystal probe capable of bonding with one or more detectable substances in a material being analyzed, and capable of, in response to exposure to a first energy, providing a second energy. Also described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and treating materials with the probe.

Weiss, Shimon; Bruchez, Marcel; Alivisatos, Paul

2012-10-16T23:59:59.000Z

410

Semiconductor nanocrystal probes for biological applications and process for making and using such probes  

SciTech Connect

A semiconductor nanocrystal compound and probe are described. The compound is capable of linking to one or more affinity molecules. The compound comprises (1) one or more semiconductor nanocrystals capable of, in response to exposure to a first energy, providing a second energy, and (2) one or more linking agents, having a first portion linked to the one or more semiconductor nanocrystals and a second portion capable of linking to one or more affinity molecules. One or more semiconductor nanocrystal compounds are linked to one or more affinity molecules to form a semiconductor nanocrystal probe capable of bonding with one or more detectable substances in a material being analyzed, and capable of, in response to exposure to a first energy, providing a second energy. Also described are processes for respectively: making the semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and treating materials with the probe.

Weiss, Shimon (Pinole, CA); Bruchez, Marcel (Newark, CA); Alivisatos, Paul (Oakland, CA)

2011-12-20T23:59:59.000Z

411

Bone scanning in the detection of occult fractures  

SciTech Connect

The potential role of bone scanning in the early detection of occult fractures following acute trauma was investigated. Technetium 99m pyrophosphate bone scans were obtained in patients with major clinical findings and negative or equivocal roentgenograms following trauma. Bone scanning facilitated the prompt diagnosis of occult fractures in the hip, knee, wrist, ribs and costochondral junctions, sternum, vertebrae, sacrum, and coccyx. Several illustrative cases are presented. Roentgenographic confirmation occurred following a delay of days to weeks and, in some instances, the roentgenographic findings were subtle and could be easily overlooked. This study demonstrates bone scanning to be invaluable and definitive in the prompt detection of occult fractures.

Batillas, J.; Vasilas, A.; Pizzi, W.F.; Gokcebay, T.

1981-07-01T23:59:59.000Z

412

Multi-level scanning method for defect inspection  

DOE Patents (OSTI)

A method for performing scanned defect inspection of a collection of contiguous areas using a specified false-alarm-rate and capture-rate within an inspection system that has characteristic seek times between inspection locations. The multi-stage method involves setting an increased false-alarm-rate for a first stage of scanning, wherein subsequent stages of scanning inspect only the detected areas of probable defects at lowered values for the false-alarm-rate. For scanning inspection operations wherein the seek time and area uncertainty is favorable, the method can substantially increase inspection throughput.

Bokor, Jeffrey (Oakland, CA); Jeong, Seongtae (Richmond, CA)

2002-01-01T23:59:59.000Z

413

Scanning Electron Microscope 1: Zeiss Ultra-60 FESEM  

Science Conference Proceedings (OSTI)

Scanning Electron Microscope 1: Zeiss Ultra-60 FESEM. ... Secondary and backscattered electron detectors; Images structures down to 10 nm in size; ...

2013-05-30T23:59:59.000Z

414

A TECHNIQUE FOR PRIMARY BEAM CALIBRATION OF DRIFT-SCANNING, WIDE-FIELD ANTENNA ELEMENTS  

SciTech Connect

We present a new technique for calibrating the primary beam of a wide-field, drift-scanning antenna element. Drift-scan observing is not compatible with standard beam calibration routines, and the situation is further complicated by difficult-to-parameterize beam shapes and, at low frequencies, the sparsity of accurate source spectra to use as calibrators. We overcome these challenges by building up an interrelated network of source 'crossing points'-locations where the primary beam is sampled by multiple sources. Using the single assumption that a beam has 180 Degree-Sign rotational symmetry, we can achieve significant beam coverage with only a few tens of sources. The resulting network of crossing points allows us to solve for both a beam model and source flux densities referenced to a single calibrator source, circumventing the need for a large sample of well-characterized calibrators. We illustrate the method with actual and simulated observations from the Precision Array for Probing the Epoch of Reionization.

Pober, Jonathan C.; Parsons, Aaron R. [Astronomy Department, University of California, Berkeley, CA (United States); Jacobs, Daniel C. [School of Earth and Space Exploration, Arizona State University, Tempe, AZ (United States); Aguirre, James E.; Moore, David F. [Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, PA (United States); Bradley, Richard F.; Parashare, Chaitali R. [Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA (United States); Carilli, Chris L. [National Radio Astronomy Observatory, Socorro, NM (United States); Gugliucci, Nicole E. [Department of Astronomy, University of Virginia, Charlottesville, VA (United States)

2012-02-15T23:59:59.000Z

415

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope  

SciTech Connect

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p {<=}10{sup -10} mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter [Department of Physics, McGill University, 3600 Rue University, Montreal, QC H3A2T8 (Canada)

2011-11-15T23:59:59.000Z

416

Lens-array PDV Probe Using a Pyramid Prism  

SciTech Connect

A bug eye probe is shown using a pyramid prism, and its advantages and disadvantages are enumerated. Also shown is abug eye imaging probe, with its advantages and disadvantages enumerated.

Malone, R. M., Kaufman, M. I., Cox, B., Romero, V., Cata B., Sorenson, D. Pazuchanics, P.

2011-11-01T23:59:59.000Z

417

Probing Core-Hole Localization in Molecular Nitrogen  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Core-Hole Localization in Molecular Nitrogen Probing Core-Hole Localization in Molecular Nitrogen Print Wednesday, 25 February 2009 00:00 The behavior of the core hole...

418

Icing Wind Tunnel Tests on the CSIRO Liquid Water Probe  

Science Conference Proceedings (OSTI)

Wet wind tunnel tests have been Performed on several versions of the CSIRO probe designed for the airborne measurement of liquid water content. Four different controller units and 17 different Probe sensors (including half-size and shielded ...

W. D. King; J. E. Dye; D. Baumgardner; J. W. Strapp; D. Huffman

1985-09-01T23:59:59.000Z

419

Surface enhanced Raman gene probe and methods thereof  

DOE Patents (OSTI)

The subject invention disclosed is a new gene probe biosensor and methods based on surface enhanced Raman scattering (SERS) label detection. The SER gene probe biosensor comprises a support means, a SER gene probe having at least one oligonucleotide strand labeled with at least one SERS label, and a SERS active substrate disposed on the support means and having at least one of the SER gene probes adsorbed thereon. Biotargets such as bacterial and viral DNA, RNA and PNA are detected using a SER gene probe via hybridization to oligonucleotide strands complementary to the SER gene probe. The support means includes a fiberoptic probe, an array of fiberoptic probes for performance of multiple assays and a waveguide microsensor array with charge-coupled devices or photodiode arrays. 18 figs.

Vo-Dinh, T.

1998-02-24T23:59:59.000Z

420

Frequency Response of a Thermistor Temperature Probe in Air  

Science Conference Proceedings (OSTI)

An analytical study was conducted of the thermal frequency response of an atmospheric temperature probe consisting of a thermistor bead with two lead wires soldered to thin support posts. Such probes are used in aircraft temperature sensors and ...

P. L. Fuehrer; C. A. Friehe; D. K. Edwards

1994-04-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


421

Test probe for surface mounted leadless chip carrier  

DOE Patents (OSTI)

A test probe for a surface mounted leadless chip carrier is disclosed. The probed includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe.

Meyer, Kerry L. (Raytown, MO); Topolewski, John (Lenexa, KS)

1989-05-23T23:59:59.000Z

422

Method for replicating an array of nucleic acid probes  

DOE Patents (OSTI)

The invention relates to the replication of probe arrays and methods for replicating arrays of probes which are useful for the large scale manufacture of diagnostic aids used to screen biological samples for specific target sequences. Arrays created using PCR technology may comprise probes with 5{prime}- and/or 3{prime}-overhangs. 16 figs.

Cantor, C.R.; Przetakiewicz, M.; Smith, C.L.; Sano, T.

1998-08-18T23:59:59.000Z

423

Method for replicating an array of nucleic acid probes  

DOE Patents (OSTI)

The invention relates to the replication of probe arrays and methods for replicating arrays of probes which are useful for the large scale manufacture of diagnostic aids used to screen biological samples for specific target sequences. Arrays created using PCR technology may comprise probes with 5'- and/or 3'-overhangs.

Cantor, Charles R. (Boston, MA); Przetakiewicz, Marek (Boston, MA); Smith, Cassandra L. (Boston, MA); Sano, Takeshi (Boston, MA)

1998-01-01T23:59:59.000Z

424

Non-Contact Gaging with Laser Probe  

Science Conference Proceedings (OSTI)

A gage has been constructed using conventional (high end) components for the application of measuring fragile syntactic foam parts in a non-contact mode. Success with this approach has been achieved through a novel method of transferring (mapping) high accuracy local measurements of a coated aluminum master, taken on a Leitz Coordinate Measurement Machine (CMM), to the gage software system. The mapped data is then associated with local voltage readings from two (inner and outer) laser triangulating probes. This couples discreet laser probe offset and linearity characteristics to the measured master geometry. The gage software compares real part measured data against the master data to provide non-contact part inspection that results in a high accuracy and low uncertainty performance. Uncertainty from the part surface becomes the prevailing contributor to the gaging process. The gaging process provides a high speed, hands off measurement with nearly zero impedance.

Clinesmith, Mike

2009-03-20T23:59:59.000Z

425

Probing Nano-Mechanical QED Effects  

E-Print Network (OSTI)

We propose and study an "intrinsic probing" approach, without introducing any external detector, to mimic cavity QED effects in a qubit-nanomechanical resonator system. This metallic nanomechanical resonator can act as an intrinsic detector when a weak driving current passes through it. The nanomechanical resonator acts as both the cavity and the detector. A cavity QED-like effect is demonstrated by the correlation spectrum of the electromotive force between the two ends of the nanomechanical resonator. Using the quantum regression theorem and perturbation theory, we analytically calculate the correlation spectrum. In the weak driving limit, we study the effect on the vacuum Rabi splitting of both the strength of the driving as well as the frequency-detuning between the charge qubit and the nanomechanical resonator. Numerical calculations confirm the validity of our intrinsic probing approach.

Y. B. Gao; S. Yang; Yu-xi Liu; C. P. Sun; Franco Nori

2009-02-15T23:59:59.000Z

426

Gating internal nodes to reduce power during scan shift  

Science Conference Proceedings (OSTI)

It is a common practice to gate a limited number of scan cells in order to reduce overall switching activity during shift, thereby, reducing the circuit's dynamic power consumption. In this paper, we propose a novel approach to reduce overall shift power ... Keywords: gating internal nodes, low power test, scan shift power reduction

Dheepakkumaran Jayaraman; Rajamani Sethuram; Spyros Tragoudas

2010-05-01T23:59:59.000Z

427

Scan Test Response Compaction Combined with Diagnosis Capabilities  

Science Conference Proceedings (OSTI)

As today's process technologies are combined with ever increasing design sizes, the result is a dramatic increase in the number of scan test vectors that must be applied during manufacturing test. The increased chip complexities, in combination with ... Keywords: ATE, ATPG, Design for test, Diagnosis, Scan compression, Yield

Sverre Wichlund; Frank Berntsen; Einar Johan Aas

2008-06-01T23:59:59.000Z

428

Immersive mobile gaming with scanned laser pico projection systems  

Science Conference Proceedings (OSTI)

A scanned laser pico projector's advantages, in the space of motion sensed and/or mobile gaming, is explored in this paper. In order to better appreciate the applications, we first briefly delve into the operation of a MicroVision MEMS-based scanned ...

P. Selvan Viswanathan; David Lashmet; Jari Honkanen

2011-11-01T23:59:59.000Z

429

Improvements in 500-kHz Ultrasonic Phased-Array Probe Designs for Evaluation of Thick Section Cast Austenitic Stainless Steel Piping Welds  

Science Conference Proceedings (OSTI)

PNNL has been studying and performing confirmatory research on the inspection of piping welds in coarse-grained steels for over 30 years. More recent efforts have been the application of low frequency phased array technology to this difficult to inspect material. The evolution of 500 kHz PA probes and the associated electronics and scanning protocol are documented in this report. The basis for the probe comparisons are responses from one mechanical fatigue crack and two thermal fatigue cracks in large-bore cast mockup specimens on loan from the Electric Power Research Institution. One of the most significant improvements was seen in the use of piezo-composite elements in the later two probes instead of the piezo-ceramic material used in the prototype array. This allowed a reduction in system gain of 30 dB and greatly reduced electronic noise. The latest probe had as much as a 5 dB increase in signal to noise, adding to its flaw discrimination capability. The system electronics for the latest probe were fully optimized for a 500 kHz center frequency, however significant improvements were not observed in the center frequency of the flaw responses. With improved scanner capabilities, smaller step sizes were used, allowing both line and raster data improvements to be made with the latest probe. The small step sizes produce high resolution images that improve flaw discrimination and, along with the increased signal-to-noise ratio inherent in the latest probe design, enhanced detection of the upper regions of the flaw make depth sizing more plausible. Finally, the physical sizes of the probes were progressively decreased allowing better access to the area of interest on specimens with weld crowns, and the latest probe was designed with non-integral wedges providing flexibility in focusing on different specimen geometries.

Crawford, Susan L.; Cinson, Anthony D.; Moran, Traci L.; Anderson, Michael T.; Diaz, Aaron A.

2011-02-01T23:59:59.000Z

430

Resistance probe for energetic particle dosimetry  

SciTech Connect

A probe for determining the energy and flux of particles in a plasma comprises a carbon film adapted to be exposed to the plasma, the film havinmg an electrical resistance which is related to the number of particles impacting the film, contacts for passing an electrical current through the film, and contacts for determining the electrical resistance of the film. An improved method for determining the energy or flux of particles in a plasma is also disclosed.

Wampler, William R. (Albuquerque, NM)

1988-01-01T23:59:59.000Z

431

Regenerable activated bauxite adsorbent alkali monitor probe  

DOE Patents (OSTI)

This invention relates to a regenerable activated bauxite adsorber alkali monitor probe for field applications to provide reliable measurement of alkali-vapor 5 concentration in combustion gas with special emphasis on pressurized fluidized-bed combustion (PFBC) off-gas. More particularly, the invention relates to the development of a easily regenerable bauxite adsorbent for use in a method to accurately determine the alkali-vapor content of PFBC 10 exhaust gases.

Lee, S.H.D.

1991-01-22T23:59:59.000Z

432

Regenerable activated bauxite adsorbent alkali monitor probe  

DOE Patents (OSTI)

A regenerable activated bauxite adsorber alkali monitor probe for field applications to provide reliable measurement of alkali-vapor concentration in combustion gas with special emphasis on pressurized fluidized-bed combustion (PFBC) off-gas. More particularly, the invention relates to the development of a easily regenerable bauxite adsorbent for use in a method to accurately determine the alkali-vapor content of PFBC exhaust gases. 6 figs.

Lee, S.H.D.

1992-12-22T23:59:59.000Z

433

Mechanical probing of liquid foam aging  

E-Print Network (OSTI)

We present experimental results on the Stokes experiment performed in a 3D dry liquid foam. The system is used as a rheometric tool : from the force exerted on a 1cm glass bead, plunged at controlled velocity in the foam in a quasi static regime, local foam properties are probed around the sphere. With this original and simple technique, we show the possibility of measuring the foam shear modulus, the gravity drainage rate and the evolution of the bubble size during coarsening.

Isabelle Cantat; Olivier Pitois

2006-09-19T23:59:59.000Z

434

Dielectric covered hairpin probe for its application in reactive plasmas  

Science Conference Proceedings (OSTI)

The hairpin probe is a well known technique for measuring local electron density in low temperature plasmas. In reactive plasmas, the probe characteristics are affected by surface sputtering, contamination, and secondary electron emission. At higher densities, the plasma absorbs the entire electromagnetic energy of hairpin and hence limits the density measurements. These issues can be resolved by covering the hairpin surface with a thin layer of dielectric. In this letter, the dielectric contribution to the probe characteristics is incorporated in a theory which is experimentally verified. The dielectric covering improves the performance of probe and also allows the hairpin tip to survive in reactive plasma where classical electrical probes are easily damaged.

Gogna, G. S.; Gaman, C.; Turner, M. M. [NCPST, School of Physical Sciences, Dublin City University, Dublin 9 (Ireland); Karkari, S. K. [Institute for Plasma Research Center, Bhat Gandhinagar, Gujarat 382428 (India)

2012-07-23T23:59:59.000Z

435

NCEM National Center for Electron Microscopy: Becoming an NCEM User  

NLE Websites -- All DOE Office Websites (Extended Search)

New Research New Research Gallery Microscopy Links Becoming an NCEM User Step 1: Submit a proposal Step 2: Before you begin your research Step 3: Instrument qualification Step 4: Accessing NCEM facilities and performing research Step 1: Submit a proposal Deadlines for new proposals are March 15, June 15, September 15, December 15. Access to NCEM facilities is granted to researchers whose proposals are accepted by the NCEM proposal review committee. NCEM users are expected to have a strong background in transmission electron microscopy, and submitted proposals should include evidence of prior electron microscopy experience by the intended operator. Researchers who do not have sufficient experience in electron microscopy may be able to use NCEM facilities through a collaborative project.

436

NCEM National Center for Electron Microscopy: Contact NCEM  

NLE Websites -- All DOE Office Websites (Extended Search)

General Contact Jane Cavlina National Center for Electron Microscopy, MS 72-150 Lawrence Berkeley National Laboratory Berkeley, CA 94720 Tel.: (510) 486-6036 Fax: (510) 486-5888...

437

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in...

438

Target-specific contrast agents for magnetic resonance microscopy  

E-Print Network (OSTI)

High-resolution ex vivo magnetic resonance microscopy (MRM) can be used to delineate prominent architectonic features in the human brain, but increased contrast is required to visualize more subtle distinctions. The goal ...

Hepler Blackwell, Megan Leticia

2007-01-01T23:59:59.000Z

439

Estimating Geometric Dislocation Densities in Polycrystalline Materialsfrom Orientation Imaging Microscopy  

Science Conference Proceedings (OSTI)

Herein we consider polycrystalline materials which can be taken as statistically homogeneous and whose grains can be adequately modeled as rigid-plastic. Our objective is to obtain, from orientation imaging microscopy (OIM), estimates of geometrically necessary dislocation (GND) densities.

Man, Chi-Sing [University of Kentucky; Gao, Xiang [University of Kentucky; Godefroy, Scott [University of Kentucky; Kenik, Edward A [ORNL

2010-01-01T23:59:59.000Z

440

Definition: 2-M Probe Survey | Open Energy Information  

Open Energy Info (EERE)

Definition Definition Edit with form History Facebook icon Twitter icon » Definition: 2-M Probe Survey Jump to: navigation, search Dictionary.png 2-M Probe Survey Probe surveys are used to physically identify and delineate thermal anomalies. A 2-m long hollow steel tube with a tungsten-carbide alloy tip is driven into the ground using a hammer drill. Then a high-precision resistive-temperature device is inserted into the tube. The probe is then left in place for at least one hour.[2] Also Known As Probe Survey, 30-cm Probe Survey, (Temperature) Probe Survey References ↑ Mark F. Coolbaugh,Chris Sladek,James E. Faulds,Richard E. Zehner,Gary L. Oppliger. 2007. Use of Rapid Temperature Measurements at a 2-Meter Depth to Augment Deeper Temperature Gradient Drilling. In:

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


441

Cone penetrometer fiber optic raman spectroscopy probe assembly  

DOE Patents (OSTI)

A chemically and mechanically robust optical Raman spectroscopy probe assembly that can be incorporated in a cone penetrometer (CPT) for subsurface deployment. This assembly consists of an optical Raman probe and a penetrometer compatible optical probe housing. The probe is intended for in-situ chemical analysis of chemical constituents in the surrounding environment. The probe is optically linked via fiber optics to the light source and the detection system at the surface. A built-in broadband light source provides a strobe method for direct measurement of sample optical density. A mechanically stable sapphire window is sealed directly into the side-wall of the housing using a metallic, chemically resistant, hermetic seal design. This window permits transmission of the interrogation light beam and the resultant signal. The spectroscopy probe assembly is capable of accepting Raman, Laser induced Fluorescence, reflectance, and other optical probes with collimated output for CPT deployment.

Kyle, Kevin R. (Brentwood, CA); Brown, Steven B. (Livermore, CA)

2000-01-01T23:59:59.000Z

442

Performance bounds on synchronous laser line scan systems  

E-Print Network (OSTI)

," in Ocean Optics VI, S. Q. Duntley, Ed., SPIE 28, (1979). 9. J. S. Jaffe, "Monte Carlo Modeling, such as optical microscopy and semiconductor wafer inspection, where more often than not, resolution is imposed

Jaffe, Jules

443

Induction of DNA Damage by Low Dose PET scans  

NLE Websites -- All DOE Office Websites (Extended Search)

Induction of DNA Damage by Low Dose PET scans Induction of DNA Damage by Low Dose PET scans Douglas Boreham McMaster University Abstract This research is focused on assessing the radiation risk associated with positron emission tomography (PET) scans. It has been suggested that low dose medical imaging, such as PET scans, carry an added biological risk because they expose the patient to ionizing radiation. PET scanning is an increasingly used nuclear medicine procedure that requires the administration of isotope 18F-fluorodeoxyglucose (18F-FDG, E=250 keV β and 511 keV γ) and results in an effective dose to the patient ranging from 7-22 mSv. The radiation induced DNA damage associated with a PET scan was studied in 7-9 week old female wild type Trp53 +/+ mice. Mice were given a PET scan with 18F-FDG and the biological response was assessed in bone marrow using

444

Organo luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes  

SciTech Connect

A semiconductor nanocrystal compound is described capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source or a particle beam; and (2) an affinity molecule linked to the semiconductor nanocrystal. The semiconductor nanocrystal is linked to an affinity molecule to form a semiconductor nanocrystal probe capable of bonding with a detectable substance. Exposure of the semiconductor nanocrystal to excitation energy will excite the semiconductor nanocrystal causing the emission of electromagnetic radiation. Further described are processes for respectively: making the luminescent semiconductor nanocrystal compound; making the semiconductor nanocrystal probe; and using the probe to determine the presence of a detectable substance in a material.

Weiss, Shimon (Pinole, CA); Bruchez, Jr., Marcel (Albany, CA); Alivisatos, Paul (Oakland, CA)

2008-01-01T23:59:59.000Z

445

Applications of CAT scanning for oil and gas production research  

SciTech Connect

Computer Axial Tomography (CAT scanning) is a valuable tool in production research because it provides the ability to nondestructively identify and evaluate the internal structural characteristics of reservoir core material systems. CAT scanning can be applied to obtain either qualitative (visual) or quantitative (numerical) data. Specific applications include core analysis and fluid flow studies. In this paper, the authors' general explanation of the instrumentation and theory is provided along with specific examples of CAT scanning applications to several reservoir core material systems.

Coles, M.E.; Muegge, E.L.; Sprunt, E.S. (Mobil Research and Development Corp., Dallas, TX (United States))

1991-04-01T23:59:59.000Z

446

Los Alamos: MST: MST-6: EML: Electron Microscopy Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) FEI Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) This is a versatile field emission scanning electron microscope integrated with a focused ion beam column that is used for sophisticated SEM and TEM sample preparation, micromachining, and ultrahigh resolution SEM imaging. The microscope is also equipped for x-ray microanalysis and crystallographic orientation imaging. Microscope consists of a Hexalens SFEG electron beam column, and a Magnum ion beam column with a gallium liquid metal ion source. Imaging with both secondary electrons and ions. Digital image acquisition. Small, stable, high brightness Schottky based field emission electron source provides 1.5 nm resolution at 30 kV. Three electron beam lens modes - normal imaging, high resolution imaging, and EDS imaging.

447

NCEM National Center for Electron Microscopy: Microscopes and...  

NLE Websites -- All DOE Office Websites (Extended Search)

The system contains both a focused Ga+ ion beam and a field emission scanning electron column. The ion column can be used for selective removal of material by ion beam...

448

Towards local electromechanical probing of cellular and biomolecular systems in a liquid environment  

E-Print Network (OSTI)

Electromechanical coupling is ubiquitous in biological systems with examples ranging from simple piezoelectricity in calcified and connective tissues to voltage-gated ion channels, energy storage in mitochondria, and electromechanical activity in cardiac myocytes and outer hair cell stereocilia. Piezoresponse force microscopy (PFM) has originally emerged as a technique to study electromechanical phenomena in ferroelectric materials, and in recent years, has been employed to study a broad range of non-ferroelectric polar materials, including piezoelectric biomaterials. At the same time, the technique has been extended from ambient to liquid imaging on model ferroelectric systems. Here, we present results on local electromechanical probing of several model cellular and biomolecular systems, including insulin and lysozyme amyloid fibrils, breast adenocarcinoma cells, and bacteriorhodopsin in a liquid environment. The specific features of SPM operation in liquid are delineated and bottlenecks on the route towards nanometer-resolution electromechanical imaging of biological systems are identified.

Sergei V. Kalinin; Brian J. Rodriguez; Stephen Jesse; Katyayani Seal; Roger Proksch; Sophia Hohlbauch; Irene Revenko; Gary Lee Thompson; Alexey A. Vertegel

2007-04-30T23:59:59.000Z

449

True Along-Track Scan to Improve Radiation Budget Estimations  

Science Conference Proceedings (OSTI)

Multiangle approaches for radiance-to-flux conversion require accurate coregistration between the observations from nadir- and oblique-viewing directions. The along-track mode of Earth Radiation Budget (ERB) scanning instruments, such as the ...

Michel Capderou; Michel Viollier

2006-08-01T23:59:59.000Z

450

Achieving sub-10-nm resolution using scanning electron beam lithography  

E-Print Network (OSTI)

Achieving the highest possible resolution using scanning-electron-beam lithography (SEBL) has become an increasingly urgent problem in recent years, as advances in various nanotechnology applications have driven demand for ...

Cord, Bryan M. (Bryan Michael), 1980-

2009-01-01T23:59:59.000Z

451

Simulation and characterization of a miniaturized Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

A miniaturized Scanning Electron Microscope (mini-SEM) for in-situ lunar investigations is being developed at NASA Marshall Space Flight Center with colleagues from the University of Alabama in Huntsville (UAH), Advanced Research Systems (ARS), and the ...

Jessica. A. Gaskin; Gregory A. Jerman; Stephanie Medley; Don Gregory; Terry O. Abbott; Allen R. Sampson

2011-03-01T23:59:59.000Z

452

Genome scanning : an AFM-based DNA sequencing technique  

E-Print Network (OSTI)

Genome Scanning is a powerful new technique for DNA sequencing. The method presented in this thesis uses an atomic force microscope with a functionalized cantilever tip to sequence single stranded DNA immobilized to a mica ...

Elmouelhi, Ahmed (Ahmed M.), 1979-

2003-01-01T23:59:59.000Z

453

A novel random access scan flip-flop design  

E-Print Network (OSTI)

Serial scan design causes unnecessary switching activity during testing causing enormous power dissipation. The test time increases enormously with the increase in number of flip-flops. An alternate to serial scan architecture is Random Access Scan (RAS). Here every flip-flop is uniquely addressed using an address decoder. Although it may seem to have solved most of the current problems associated with testing integrated circuits, yet one may impulsively conclude that the routing and area overhead associated with RAS is prohibitive. We present a design of the RAS flip-flop which uses a unique “toggle” mechanism, possible only in RAS. We minimize the number of gates (transistors) and eliminate the need for two globally routed (scan in and test control) signals present in earlier designs. Our design is built keeping in focus the address decoder complexity to a bare minimum. Our multistage scan-out system enables the addressed flip-flop to be observed without compromising performance due to a slow output bus. We have estimated the additional gates required to implement RAS over serial scan (SS). The design obtained equal fault coverage, 60 % test vector reduction and 99 % lesser power dissipation as compared to SS. 1.

S. Mudlapur; Vishwani D. Agrawal; Adit D. Singh

2005-01-01T23:59:59.000Z

454

Organo Luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes  

DOE Patents (OSTI)

A luminescent semiconductor nanocrystal compound is described which is capable of linking to an affinity molecule. The compound comprises (1) a semiconductor nanocrystal capable of emitting electromagnetic radiation (luminescing) in a narrow wavelength band and/or absorbing energy, and/or scattering or diffracting electromagnetic radiation--when excited by an electromagnetic radiation source (of narrow or broad bandwidth) or a particle beam; and (2) at least one linking agent, having a first portion linked to the semiconductor nanocrystal and a second portion capable of linking to an affinity molecule. The luminescent semiconductor nanocrystal compound is linked to an affinity molecule to form an organo luminescent semiconductor nanocrystal probe capable of bonding with a detectable substance in a material being analyzed, and capable of emitting electromagnetic radiation in a narrow wavelength band and/or absorbing, scattering, or diffracting energy when excited by an electromagnetic radiation source (of narrow or broad bandwidth) or a particle beam. The probe is stable to repeated exposure to light in the presence of oxygen and/or other radicals. Further described is a process for making the luminescent semiconductor nanocrystal compound and for making the organo luminescent semiconductor nanocrystal probe comprising the luminescent semiconductor nanocrystal compound linked to an affinity molecule capable of bonding to a detectable substance. A process is also described for using the probe to determine the presence of a detectable substance in a material.

Weiss, Shimon (Pinole, CA); Bruchez, Jr., Marcel (Albany, CA); Alivisatos, Paul (Oakland, CA)

1999-01-01T23:59:59.000Z

455

Design of a cone-penetrometer-compatible probe and housing: The LLNL Raman probe  

E-Print Network (OSTI)

probe designed for cone penetrometer and hand-held use and constructed at Lawrence Livermore National There exist 177 underground storage tanks at the U.S. Department of Energy DOE Hanford site that have been in a few hours from surface to bottom. Applied Re- search Associates ARA was contracted by DOE Hanford

Myrick, Michael Lenn

456

Probing Color Octet Electrons at the LHC  

E-Print Network (OSTI)

Models with quark and lepton compositeness predict the existence of colored partners of the Standard Model leptons. In this paper we study the LHC phenomenology of a charged colored lepton partner, namely the color octet electron, $e_8$ in an effective theory framework. We explore various mechanisms for resonant production of $e_8$'s. With the pair production channel the 14 TeV LHC can probe $e_8$'s with masses up to 2.5 TeV (2.8 TeV) with 100 fb$^{-1}$ (300 fb$^{-1}$) of integrated luminosity. A common feature in all the resonant production channels is the presence of two high $p_T$ electrons and at least one high $p_T$ jet in the final state. Using this feature, we implement a search method where the signal is a combination of pair and single production events. This method has potential to increase the LHC reach significantly. Using the combined signal we estimate the LHC discovery potential for the $e_8$'s. Our analysis shows that the LHC with 14 TeV center-of-mass energy and 100 fb$^{-1}$ (300 fb$^{-1}$) of integrated luminosity can probe $e_8$'s with masses up to 3.4 TeV (4 TeV) for the compositeness scale of 5 TeV.

Tanumoy Mandal; Subhadip Mitra

2012-11-27T23:59:59.000Z

457

Probe with integrated heater and thermocouple pack  

DOE Patents (OSTI)

A probe for measuring heat includes an elongate rod fitted within a sheath, and a plurality of annular recesses are formed on the surface of the rod in a spaced-apart relationship to form annular chambers that are resistant to heat flow. A longitudinal bore extends axially into the rod and within the cylinders defined by the annular chambers, and an integrated heater and thermocouple pack is dimensioned to fit within the bore. In construction, the integrated pack includes a plurality of wires disposed in electrical insulation within a sheath and a heater cable. These wires include one common wire and a plurality of thermocuple wires. The common wire is constructed of one type of conductive material while the thermocouple wires are each constructed of two types of materials so that at least one thermocouple junction is formed therein. All of the wires extend the length of the integrated pack and are connected together at their ends. The thermocouple wires are constructed to form thermocouple junctions proximate to each annular chamber for producing electromotive forces corresponding to the temperature of the rod within the annular chambers relative to outside the chambers. In the preferred embodiment, each thermocouple wire forms two thermocouple junctions, one junction being disposed within an annular chamber and the second junction being disposed outside of, but proximate to, the same annular chamber. In one embodiment two thermocouple wires are configured to double the sensitivity of the probe in one region.

McCulloch, Reg W. (Oak Ridge, TN); Dial, Ralph E. (Concord, TN); Finnell, Wilber K. R. (Kingston, TN)

1990-01-01T23:59:59.000Z

458

Probe with integrated heater and thermocouple pack  

DOE Patents (OSTI)

A probe for measuring heat includes an elongate rod fitted within a sheath, and a plurality of annular recesses are formed on the surface of the rod in a spaced-apart relationship to form annular chambers that are resistant to heat flow. A longitudinal bore extends axially into the rod and within the cylinders defined by the annular chambers, and an integrated heater and thermocouple pack is dimensioned to fit within the bore. In construction, the integrated pack includes a plurality of wires disposed in electrical insulation within a sheath and a heater cable. These wires include one common wire and a plurality of thermocouple wires. The common wire is constructed of one type of conductive material while the thermocouple wires are each constructed of two types of materials so that at least one thermocouple junction is formed therein. All of the wires extend the length of the integrated pack and are connected together at their ends. The thermocouple wires are constructed to form thermocouple junctions proximate to each annular chamber for producing electromotive forces corresponding to the temperature of the rod within the annular chambers relative to outside the chambers. In the preferred embodiment, each thermocouple wire forms two thermocouple junctions, one junction being disposed within an annular chamber and the second junction being disposed outside of, but proximate to, the same annular chamber. In one embodiment two thermocouple wires are configured to double the sensitivity of the probe in one region.

McCulloch, Reginald W. (Oak Ridge, TN); Dial, Ralph E. (Concord, TN); Finnell, Wilber K. R. (Kingston, TN)

1988-01-01T23:59:59.000Z

459

Swept source optical coherence microscopy for pathological assessment of cancerous tissues  

E-Print Network (OSTI)

Optical coherence microscopy (OCM) combines optical coherence tomography (OCT) with confocal microscopy and enables depth resolved visualization of biological specimens with cellular resolution. OCM offers a suitable ...

Ahsen, Osman Oguz

2013-01-01T23:59:59.000Z

460

Los Alamos provides HOPE for radiation belt storm probes  

NLE Websites -- All DOE Office Websites (Extended Search)

HOPE for radiation belt storm probes HOPE for radiation belt storm probes Los Alamos provides HOPE for radiation belt storm probes The HOPE analyzer is one of a suite of instruments that was successfully launched as part of the Radiation Belt Storm Probe mission. August 30, 2012 Artist's rendering showing two spacecraft representing the not-yet-designed Radiation Belt Storm Probes that will study the sun and its effects on Earth. PHOTO CREDIT: Johns Hopkins University Applied Physics Laboratory Artist's rendering showing two spacecraft representing the not-yet-designed Radiation Belt Storm Probes that will study the sun and its effects on Earth. PHOTO CREDIT: Johns Hopkins University Applied Physics Laboratory Contact James E. Rickman Communications Office (505) 665-9203 Email "Today we are boldly going where no spacecraft ever wants to go."

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


461

Specification for soil multisensor and soil sampling cone penetrometer probes  

SciTech Connect

Specification requirements for engineering, fabrication, and performance of cone penetrometer (CP) soil multisensor and sampling probes (CP-probes) which are required to support contract procurement for services are presented. The specification provides a documented technical basis of quality assurance that is required to use the probes in an operating Hanford tank farm. The documentation cited in this specification will be incorporated into an operational fielding plan that will address all activities associated with the use of the CP-probes. The probes discussed in this specification support the Hanford Tanks Initiative AX-104 Tank Plume Characterization Sub-task. The probes will be used to interrogate soils and vadose zone surrounding tank AX-104.

Iwatate, D.F.

1997-05-02T23:59:59.000Z

462

Surface-enhanced Raman scattering (SERS) dosimeter and probe  

DOE Patents (OSTI)

A dosimeter and probe for measuring exposure to chemical and biological compounds is disclosed. The dosimeter or probe includes a collector which may be analyzed by surface-enhanced Raman spectroscopy. The collector comprises a surface-enhanced Raman scattering-active material having a coating applied thereto to improve the adsorption properties of the collector. The collector may also be used in automated sequential devises, in probe array devices.

Vo-Dinh, Tuan (Knoxville, TN)

1995-01-01T23:59:59.000Z

463

High-frequency Probing Diagnostic for Hall Current Plasma Thrusters  

DOE Green Energy (OSTI)

High-frequency oscillations (1-100 MHz) in Hall thrusters have apparently eluded significant experimental scrutiny. A diagnostic setup, consisting of a single Langmuir probe, a special shielded probe connector-positioner, and an electronic impedance-matching circuit, was successfully built and calibrated. Through simultaneous high-frequency probing of the Hall thruster plasma at multiple locations, high-frequency plasma waves have been identified and characterized for various thruster operating conditions.

A.A. Litvak; Y. Raitses; N.J. Fisch

2001-10-25T23:59:59.000Z

464

Probing the electronic structure and optical response of a graphene quantum disk supported on monolayer graphene  

SciTech Connect

In this paper, we show that a graphene quantum disk (GQD) can be generated on monolayer graphene via structural modification using the electron beam. The electronic structure and local optical responses of the GQD, supported on monolayer graphene, were probed with electron energy-loss spectrum imaging on an aberration-corrected scanning transmission electron microscope. We observe that for small GQD, {approx}1.3 nm in diameter, the electronic structure and optical response are governed by the dominating edge states, and are distinctly different from either monolayer graphene or double-layer graphene. Highly localized plasmon modes are generated at the GQD due to the confinement from the edge of the GQD in all directions. The highly localized optical response from GQDs could find use in designing nanoscale optoelectronic and plasmonic devices based on monolayer graphene.

Zhou, Wu [Vanderbilt University; Pennycook, Stephen J [ORNL; Idrobo Tapia, Juan C [ORNL

2012-01-01T23:59:59.000Z

465

A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture  

Science Conference Proceedings (OSTI)

In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any specific clock tree construction, special scan cells, or scan chain reordering. Test ... Keywords: ATPG, peak current reduction, average power dissipation, scan designs, clock tree construction, special scan cells, scan chain reordering

Seongmoon Wang; Wenlong Wei

2007-01-01T23:59:59.000Z

466

The Application of Atom Probe Tomography to Oxide-Dispersion ...  

Science Conference Proceedings (OSTI)

Contributions of Atom Probe Tomography to the Understanding of Steels ... Investigation of the Microstructure-Property-Processing Relationships in a Series of ...

467

Probing the Structural, Electrical and Mechanical Behaviors of Nano ...  

Science Conference Proceedings (OSTI)

Abstract Scope, Examples for probing the structural, electrical and mechanical behaviors of nano-materials by various advanced TEM techniques are introduced ...

468

EGR Distribution and Fluctuation Probe Based on CO2 Measurements  

EGR Distribution and Fluctuation Probe Based on CO2 Measurements ... NOx emissions, and which involves mixing some of the exhaust with the intake air.

469

Probing surface chemistry using 'Operando' and 'Ultrafast' soft...  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing surface chemistry using 'Operando' and 'Ultrafast' soft x-ray spectroscopies Wednesday, December 18, 2013 - 3:00pm SLAC, Redtail Hawk Conference Room 108A Hirohito...

470

Probing Ultrafast Solvation Dynamics with High Repetition-Rate...  

NLE Websites -- All DOE Office Websites (Extended Search)

Highlights rss feed Probing Ultrafast Solvation Dynamics with High Repetition-Rate LaserX-ray Methodologies FEBRUARY 11, 2012 Bookmark and Share X-ray absorption, emission...

471

Probing Core-Hole Localization in Molecular Nitrogen  

NLE Websites -- All DOE Office Websites (Extended Search)

Probing Core-Hole Localization in Molecular Nitrogen Print The behavior of the core hole created in molecular x-ray photoemission experiments has provided molecular scientists with...

472

Test probe for surface mounted leadless chip carrier  

DOE Patents (OSTI)

A test probe for a surface mounted leadless chip carrier is disclosed. The probe includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe. 1 fig.

Meyer, K.L.; Topolewski, J.

1987-10-02T23:59:59.000Z

473

Transpiration Purging Access Probe for Particulate Laden or  

NLE Websites -- All DOE Office Websites (Extended Search)

need for sensors that tolerate dirty environments, research is currently active on the patent-pending technology "Transpiration Purging Access Probe for Particulate Laden or...

474

Variable temperature electrochemical strain microscopy of Sm-doped ceria  

Science Conference Proceedings (OSTI)

Variable temperature electrochemical strain microscopy has been used to study the electrochemical activity of Sm-doped ceria as a function of temperature and bias. The electrochemical strain microscopy hysteresis loops have been collected across the surface at different temperatures and the relative activity at different temperatures has been compared. The relaxation behavior of the signal at different temperatures has been also evaluated to relate kinetic process during bias induced electrochemical reactions with temperature and two different kinetic regimes have been identified. The strongly non-monotonic dependence of relaxation behavior on temperature is interpreted as evidence for water-mediated mechanisms.

Jesse, Stephen [ORNL; Morozovska, A. N. [National Academy of Science of Ukraine, Kiev, Ukraine; Kalinin, Sergei V [ORNL; Eliseev, E. A. [National Academy of Science of Ukraine, Kiev, Ukraine; Yang, Nan [ORNL; Doria, Sandra [ORNL; Tebano, Antonello [ORNL

2013-01-01T23:59:59.000Z

475

Atomic Imaging Using Secondary Electrons in a Scanning Transmission Electron Microscope: Experimental Observations and Possible Mechanisms  

SciTech Connect

We report detailed investigation of high-resolution imaging using secondaryelectrons (SE) with a sub-nanometer probe in an aberration-corrected transmissionelectron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. Apossiblemechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization.

Su, D.; Inada, H.; Egerton, R.F.; Konno, M.; Wua, L.; Ciston, J.; Wall, J.; Zhu, Y.

2011-11-11T23:59:59.000Z

476

Chemical sensor with oscillating cantilevered probe  

DOE Patents (OSTI)

The invention provides a method of detecting a chemical species with an oscillating cantilevered probe. A cantilevered beam is driven into oscillation with a drive mechanism coupled to the cantilevered beam. A free end of the oscillating cantilevered beam is tapped against a mechanical stop coupled to a base end of the cantilevered beam. An amplitude of the oscillating cantilevered beam is measured with a sense mechanism coupled to the cantilevered beam. A treated portion of the cantilevered beam is exposed to the chemical species, wherein the cantilevered beam bends when exposed to the chemical species. A second amplitude of the oscillating cantilevered beam is measured, and the chemical species is determined based on the measured amplitudes.

Adams, Jesse D

2013-02-05T23:59:59.000Z

477

Torsion-balance probes of fundamental physics  

E-Print Network (OSTI)

This white paper is submitted as part of Snowmass2013 (subgroup CF2). The extraordinary sensitivity of torsion-balances can be used to search for the ultra-feeble forces suggested by attempts to unify gravity with the other fundamental interactions. The motivation, the results and their implications as well as the future prospects of this work are summarized. The experiments include tests of the universality of free fall (weak equivalence principle), probes of the short-distance behavior of gravity (inverse-square law tests for extra dimensions and exchange forces from new meV scale bosons), and Planck-scale tests of Lorentz invariance (preferred-frame effects, non-commutative geometries).

E. G. Adelberger

2013-08-14T23:59:59.000Z

478

Dark Energy May Probe String Theory  

E-Print Network (OSTI)

The problem of dark energy arises due to its self-gravitating properties. Therefore explaining vacuum energy may become a question for the realm of quantum gravity, that can be addressed within string theory context. In this talk I concentrate on a recent, string-inspired model, that relies on nonlinear physics of short-distance perturbation modes, for explaining dark energy without any fine-tuning. Dark energy can be observationally probed by its equation of state, w. Different models predict different types of equations of state and string-inspired ones have a time dependent w(z) as their unique signature. Exploring the link between dark energy and string theory may provide indirect evidence for the latter, by means of precision cosmology data.

L. Mersini; M. Bastero-Gil

2002-12-13T23:59:59.000Z

479

Application of hydrogenation to low-temperature cleaning of the Si(001) surface in the processes of molecular-beam epitaxy: Investigation by scanning tunneling microscopy, reflected high-energy electron diffraction, and high resolution transmission electron microscopy  

Science Conference Proceedings (OSTI)

Structural properties of the clean Si(001) surface obtained as a result of low-temperature (470-650 Degree-Sign C) pre-growth annealings of silicon wafers in a molecular-beam epitaxy chamber have been investigated. To decrease the cleaning temperature, a silicon surface was hydrogenated in the process of a preliminary chemical treatment in HF and NH{sub 4}F aqueous solutions. It has been shown that smooth surfaces composed of wide terraces separated by monoatomic steps can be obtained by dehydrogenation at the temperatures Greater-Than-Or-Equivalent-To 600 Degree-Sign C, whereas clean surfaces obtained at the temperatures clean surfaces on the temperature of hydrogen thermal desorption and the process of the preliminary chemical treatment. The frequency of detachment/attachment of Si dimers from/to the steps and effect of the Ehrlich-Schwoebel barrier on ad-dimer migration across steps have been found to be the most probable factors determining a degree of the resultant surface roughness.

Arapkina, L. V.; Krylova, L. A.; Chizh, K. V.; Chapnin, V. A.; Uvarov, O. V.; Yuryev, V. A. [A. M. Prokhorov General Physics Institute of the Russian Academy of Sciences, 38 Vavilov Street, Moscow 119991 (Russian Federation)

2012-07-01T23:59:59.000Z

480

Volume Scanning Strategies for 3D Wind Retrieval from Dual-Doppler Lidar Measurements  

Science Conference Proceedings (OSTI)

Dual-Doppler lidar volume scans for 3D wind retrieval must accommodate the conflicting goals of dense spatial coverage and short scan duration. In this work, various scanning strategies are evaluated with semisynthetic wind fields from analytical ...

Susanne Drechsel; Georg J. Mayr; Michel Chong; Fotini K. Chow

2010-11-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy scanning probe" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


481

Phase Contrast Microscopy with Soft and Hard X-rays  

E-Print Network (OSTI)

Calibration ­ Uses up part of dynamic range · Solution: ­ Soft x-rays: Back side Illumination ­ Hard xPhase Contrast Microscopy with Soft and Hard X-rays Using a Segmented Detector Benjamin Hornberger ­ Phase Contrast 101 · A Segmented Detector for Hard X-ray Microprobes ­ Segmented Silicon Chip ­ Charge

Homes, Christopher C.

482

PARALLEL ION BEAM PROFILE SCAN USING LASER WIRE  

Science Conference Proceedings (OSTI)

We report on the world s first experiment of a parallel profile scan of the hydrogen ion (H-) beam using a laser wire system. The system was developed at the superconducting linac of the Spallation Neutron Source (SNS) accelerator complex. The laser wire profile scanner is based on a photo-detachment process and therefore can be conducted on an operational H- beam in a nonintrusive manner. The parallel profile scanning system makes it possible to simultaneously measure profiles of the 1-MW neutron production H- beam at 9 different locations of the linac by using a single light source. This paper describes the design, optical system and software platform development, and measurement results of the parallel profile scanning system.

Liu, Yun [ORNL; Aleksandrov, Alexander V [ORNL; Huang, Chunning [ORNL; Long, Cary D [ORNL; Dickson, Richard W [ORNL

2013-01-01T23:59:59.000Z

483

Composition analysis by scanning femtosecond laser ultraprobing (CASFLU).  

DOE Patents (OSTI)

The composition analysis by scanning femtosecond ultraprobing (CASFLU) technology scans a focused train of extremely short-duration, very intense laser pulses across a sample. The partially-ionized plasma ablated by each pulse is spectrometrically analyzed in real time, determining the ablated material's composition. The steering of the scanned beam thus is computer directed to either continue ablative material-removal at the same site or to successively remove nearby material for the same type of composition analysis. This invention has utility in high-speed chemical-elemental, molecular-fragment and isotopic analyses of the microstructure composition of complex objects, e.g., the oxygen isotopic compositions of large populations of single osteons in bone.

Ishikawa, Muriel Y. (Livermore, CA); Wood, Lowell L. (Simi Valley, CA); Campbell, E. Michael (Danveille, CA); Stuart, Brent C. (Livermore, CA); Perry, Michael D. (Livermore, CA)

2002-01-01T23:59:59.000Z

484

Atomic-Scale Investigation of Epitaxial Graphene Grown on 6H-SiC(0001) Using Scanning Tunneling Microscopy and Spectroscopy  

E-Print Network (OSTI)

. Typically, the atomic structures of the graphene were resolved at sample bias voltages below 0.5 V graphene continuously extended across four SiC bilayers, as confirmed by the line profile. A height .) 13346 J. Phys. Chem. C, Vol. 114, No. 31, 2010 Choi et al. #12;shaped protrusions at high bias voltage

Kim, Sehun

485

Scanning gate microscopy on graphene: charge inhomogeneity and extrinsic doping This article has been downloaded from IOPscience. Please scroll down to see the full text article.  

E-Print Network (OSTI)

mode tip and local top gate. Electrical transport through graphene at various back gate voltages is monitored as a function of tip voltage and tip position. Near the Dirac point, the response of graphene, USA. graphene field effect transistor (GFET), a voltage applied to a gate (capacitively coupled

Chen, Yong P.

486

Atomic scale investigations of the thermal and electron induced chemistry of small molecules on platinum(111) as revealed by scanning tunneling microscopy  

Science Conference Proceedings (OSTI)

The work presented here can be divided into two parts: 1) an experimental and analysis section dealing with the investigation of small molecules such as methyl bromide, carbon dioxide, diatomic nitrogen, methane and methane?s photochemical derivative methyl radical adsorbed onto the Pt(111) surface, and 2) A detailed explanation of the current STM and chamber, with included designs and detailed instructions for operation and maintenance of both the STM and chamber. The investigations of the methyl bromide molecule show interesting dipole-dipole interactions on the Pt(111) surface. With a (6 x 3) lattice being described as the full monolayer that was created by overdosing and annealing to 104 K. The (6 x 3) lattice is shown to occupy top sites and three fold hollow sites on the Pt(111) surface giving rise to a very sharp and symmetrically split ?2 RAIRS mode, and the absence of the ?5 mode in RAIRS is indicative that the molecules are all aligned with their C-Br bond parallel to the surface normal. Additional sub-monolayer structures were observed that had components that were not aligned with the surface normal. The submonolayer lattices ranging from a structured 0.12 ML to a random coverages estimated at 0.20 ML, to a shift in the (6 x 3) lattice resulting in a high local line coverage of 0.33 ML. Analysis of the CO2 molecules adsorbed onto the Pt(111) surface shows that there is a preferred high temperature dosing that results in a thermodynamically stable system of a (3 x 3) lattice consisting of both horizontal and vertical molecules. The coverage of the (3 x 3) lattice of vertical molecules is 0.11 ML which can be assigned to the RAIRS peak of 2287 cm-1. The vertical molecules are seen to occupy the hollow sites within the horizontal (3 x 3) lattice. The low temperature dosage of multilayers and annealing, to 78 K, show that the (3 x 3) lattice is compressed into a lattice of (5 x 3) with some of the molecules in the unit cell that are incommensurate with the Pt(111) lattice. However, isolated unit cells of the horizontal (3 x 3) lattices remain after the compression which allows a single vertical CO2 molecule to occupy the hollow site resulting in the characteristic 2277 cm-1 peak in RAIRS. The resulting local coverage of the (5 x 3) lattice is calculated to be 0.40 ML. Methane was found to adsorb onto the Pt(111) lattice in a (?3 x ?3) configuration yielding a coverage of 0.33 ML in perfect agreement with previous coverage assignments. With a full coverage of methane adsorbed onto the crystal surface an ArF excimer laser was used to photodissociate the molecules to create methyl radicals that could be imaged by STM. After photochemical deposition of methyl radicals and annealing the surface to 175 K, the STM was used to image the surface. The methyl radical were estimated to arrange in a (?3 by ?3) lattice same as the methane, and imaged as roughly 0.4 ? high protrusions from the surface with a diameter of 5.5 ?. The last molecule that was studied, was the adsorption of diatomic nitrogen on the Pt(111) surface at a temperature of 25 K. Due to the very low desorption temperature of N2 (i.e. 46 K) and the relatively high temperature of the crystal, only chemisorbed molecules were able to be resolved. The results confirm that diatomic nitrogen binds to the top side of the Pt(111) step edge in agreement with Yates RAIRS studies, and calculations by Norskov. However, there was observed a stable cluster of molecules bound to the lower side of the step edge in a (2 x 2) lattice configuration which has previously unknown before these images and is the most likely source of the photoactivity of nitrogen molecules on the crystal surface. It is the hopes of this author that the experiments described within the dissertation lead to new and better understanding of the role that the microscopic scale structures of adsorbates on the surface play in catalysis. Also that the general information of STM design, construction and tip fabrication will be useful to all students who follow me in working

Schwendemann, Todd Charles

2006-01-01T23:59:59.000Z

487

Measuring the effects of low energy ion milling on the magnetization of Co/Pd multilayers using scanning electron microscopy with polarization analysis  

E-Print Network (OSTI)

effects of low energy ion milling on the magnetization ofchange caused by the milling. In conclusion, we demonstratednm?, on the energy of ion milling is investigated using

2010-01-01T23:59:59.000Z

488

Investigation of the ligand shells of homo-ligand and mixed-ligand monolayer protected metal nanoparticles : a scanning tunneling microscopy study  

E-Print Network (OSTI)

Monolayer Protected Metal Nanoparticles have recently found widespread use in and are the focus of intensive study in many areas of scientific research ranging from biology to physics to medicine. Consisting of a nanoscale, ...

Jackson, Alicia M

2007-01-01T23:59:59.000Z

489

Near-Field Scanning Optical Microscopy (NSOM) Studies of the Relationship between Interchain Interactions, Morphology, Photodamage, and Energy Transport in Conjugated  

E-Print Network (OSTI)

for the last several years due to their potential for application in optoelectronic devices such as light-emitting diodes (LEDs),1,2 photodiodes,3 photovoltaics,4 and displays.5 It is becoming increasingly clear

Cohen, Ronald C.

490