Sample records for microscopy scanning probe

  1. Ultrafast scanning probe microscopy

    DOE Patents [OSTI]

    Weiss, Shimon (El Cerrito, CA); Chemla, Daniel S. (Kensington, CA); Ogletree, D. Frank (El Cerrito, CA); Botkin, David (San Francisco, CA)

    1995-01-01T23:59:59.000Z

    An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.

  2. Ultrafast scanning probe microscopy

    DOE Patents [OSTI]

    Weiss, S.; Chemla, D.S.; Ogletree, D.F.; Botkin, D.

    1995-05-16T23:59:59.000Z

    An ultrafast scanning probe microscopy method is described for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample. 6 Figs.

  3. Sandia National Laboratories: scanning probe microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    focus on stainless steels. Dr. An is an internationally recognized expert on scanning probe microscopy, such as atomic force microscopy and scanning ... Last Updated:...

  4. Complete information acquisition in scanning probe microscopy

    SciTech Connect (OSTI)

    Belianinov, Alex [ORNL; Kalinin, Sergei V [ORNL; Jesse, Stephen [ORNL

    2015-01-01T23:59:59.000Z

    In the last three decades, scanning probe microscopy (SPM) has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of the SPM measurements is the information transfer from the tip-surface junction to a macroscopic measurement system. This process reduces the many degrees of freedom of a vibrating cantilever to relatively few parameters recorded as images. Similarly, the details of dynamic cantilever response at sub-microsecond time scales of transients, higher-order eigenmodes and harmonics are averaged out by transitioning to millisecond time scale of pixel acquisition. Hence, the amount of information available to the external observer is severely limited, and its selection is biased by the chosen data processing method. Here, we report a fundamentally new approach for SPM imaging based on information theory-type analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material s properties and their mutual interactions, and SPM imaging at the information channel capacity limit.

  5. Scanning probe microscopy studies of semiconductor surfaces

    SciTech Connect (OSTI)

    Weinberg, W.H. [Univ. of California, Santa Barbara, CA (United States)

    1996-10-01T23:59:59.000Z

    Recent work involving atomic force microscopy and scanning tunneling microscopy is discussed which involves strain-induced, self-assembling nanostructures in compound semiconductor materials. Specific examples include one-dimensional quantum wires of InAs grown by MBE on GaAs(001) and zero-dimensional quantum dots of InP grown by MOCVD on InGaP which is lattice matched to GaAs(001).

  6. Band excitation method applicable to scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen; Kalinin, Sergei V

    2013-05-28T23:59:59.000Z

    Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.

  7. Band excitation method applicable to scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen (Knoxville, TN) [Knoxville, TN; Kalinin, Sergei V. (Knoxville, TN) [Knoxville, TN

    2010-08-17T23:59:59.000Z

    Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.

  8. Scanning probe microscopy: Sulfate minerals in scales and cements

    SciTech Connect (OSTI)

    Hall, C. [Schlumberger Cambridge Research (United Kingdom)

    1995-11-01T23:59:59.000Z

    The principles of scanning probe microscopy (SPM) are illustrated with examples from oilfield mineralogy, particularly emphasizing sulfate minerals involved in scale formation and cement hydration chemistry. The topography of the (010) cleavage surface of gypsum observed by atomic force microscopy shows atomically flat terraces separated by shallow steps often only one unit cell high. SPM allows direct observation of processes on mineral surfaces while they are in contact with solutions. The dissolution etching and crystal growth of gypsum and barite are discussed and rates of step migration estimated. The orientation of steps is related to the crystallographic axes. The action of phosphonate crystal growth inhibitor on gypsum and of a chelating scale solvent on barite are also shown. The multiphase microstructure of an oilwell cement clinker is described in relation to its hydration chemistry in contact with water and its reaction with sulfate ions.

  9. In-situ scanning probe microscopy of electrodeposited nickel.

    SciTech Connect (OSTI)

    Kelly, James J.; Dibble, Dean C.

    2004-10-01T23:59:59.000Z

    The performance characteristics and material properties such as stress, microstructure, and composition of nickel coatings and electroformed components can be controlled over a wide range by the addition of small amounts of surface-active compounds to the electroplating bath. Saccharin is one compound that is widely utilized for its ability to reduce tensile stress and refine grain size in electrodeposited nickel. While the effects of saccharin on nickel electrodeposition have been studied by many authors in the past, there is still uncertainty over saccharin's mechanisms of incorporation, stress reduction, and grain refinement. In-situ scanning probe microscopy (SPM) is a tool that can be used to directly image the nucleation and growth of thin nickel films at nanometer length scales to help elucidate saccharin's role in the development and evolution of grain structure. In this study, in-situ atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques are used to investigate the effects of saccharin on the morphological evolution of thin nickel films. By observing mono-atomic height nickel island growth with and without saccharin present we conclude that saccharin has little effect on the nickel surface mobility during deposition at low overpotentials where the growth occurs in a layer-by-layer mode. Saccharin was imaged on Au(l11) terraces as condensed patches without resolved packing structure. AFM measurements of the roughness evolution of nickel films up to 1200 nm thick on polycrystalline gold indicate that saccharin initially increases the roughness and surface skewness of the deposit that at greater thickness becomes smoother than films deposited without saccharin. Faceting of the deposit morphology decreases as saccharin concentration increases even for the thinnest films that have 3-D growth.

  10. Scanning probe microscopy with inherent disturbance suppression using micromechanical systems

    E-Print Network [OSTI]

    Sparks, Andrew William, 1977-

    2005-01-01T23:59:59.000Z

    All scanning probe microscopes (SPMs) are affected by disturbances, or mechanical noise, in their environments which can limit their imaging resolution. This thesis introduces a general approach for suppressing out-of-plane ...

  11. Dynamic scanning probe microscopy of adsorbed molecules on graphite

    E-Print Network [OSTI]

    N. Berdunov; A. J. Pollard; P. H. Beton

    2009-01-08T23:59:59.000Z

    We have used a combined dynamic scanning tunneling and atomic force microscope to study the organisation of weakly bound adsorbed molecules on a graphite substrate. Specifically we have acquired images of islands of the perylene derivative molecules. These weakly bound molecules may be imaged in dynamic STM, in which the probe is oscillated above the surface. We show that molecular resolution may be readily attained and that a similar mode of imaging may be realised using conventional STM arrangement. We also show, using tunnelling spectroscopy, the presence of an energy gap for the adsorbed molecules confirming a weak molecule-substrate interaction.

  12. The AFM was originally developed as an adaptation of another scanning probe microscopy technology, the scanning tunneling

    E-Print Network [OSTI]

    Van Vliet, Krystyn J.

    The AFM was originally developed as an adaptation of another scanning probe microscopy technology, the scanning tunneling microscope, to image nonconductive materials through direct physical contact between-scale displacement resolutions of the AFM enable the topographical scanning of mechanically compliant materials

  13. Josephson scanning tunneling microscopy -- a local and direct probe of the superconducting order parameter

    E-Print Network [OSTI]

    Kimura, Hikari

    2010-01-01T23:59:59.000Z

    Title Josephson scanning tunneling microscopy – a local andthe sample using a novel scanning tunneling microscope (STM)discussed. I. INTRODUCTION Scanning tunneling microscopy (

  14. Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

    SciTech Connect (OSTI)

    Eliseev, E. A. [National Academy of Science of Ukraine, Kiev, Ukraine] [National Academy of Science of Ukraine, Kiev, Ukraine; Morozovska, A. N. [National Academy of Science of Ukraine, Kiev, Ukraine] [National Academy of Science of Ukraine, Kiev, Ukraine; Ievlev, Anton [ORNL] [ORNL; Balke, Nina [ORNL] [ORNL; Maksymovych, Petro [ORNL] [ORNL; Tselev, Alexander [ORNL] [ORNL; Kalinin, Sergei V [ORNL] [ORNL

    2014-01-01T23:59:59.000Z

    Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

  15. Nanoscale Electromechanics of Ferroelectric and Biological Systems: A New Dimension in Scanning Probe Microscopy

    SciTech Connect (OSTI)

    Kalinin, Sergei V [ORNL; Rodriguez, Brian J [ORNL; Jesse, Stephen [ORNL; Karapetian, Edgar [ORNL; Mirman, B [Suffolk University, Boston; Eliseev, E. A. [National Academy of Science of Ukraine, Kiev, Ukraine; Morozovska, A. N. [National Academy of Science of Ukraine, Kiev, Ukraine

    2007-01-01T23:59:59.000Z

    Functionality of biological and inorganic systems ranging from nonvolatile computer memories and microelectromechanical systems to electromotor proteins and cellular membranes is ultimately based on the intricate coupling between electrical and mechanical phenomena. In the past decade, piezoresponse force microscopy (PFM) has been established as a powerful tool for nanoscale imaging, spectroscopy, and manipulation of ferroelectric and piezoelectric materials. Here, we give an overview of the fundamental image formation mechanism in PFM and summarize recent theoretical and technological advances. In particular, we show that the signal formation in PFM is complementary to that in the scanning tunneling microscopy (STM) and atomic force microscopy (AFM) techniques, and we discuss the implications. We also consider the prospect of extending PFM beyond ferroelectric characterization for quantitative probing of electromechanical behavior in molecular and biological systems and high-resolution probing of static and dynamic polarization switching processes in low-dimensional ferroelectric materials and heterostructures.

  16. The Use Of Scanning Probe Microscopy To Investigate Crystal-Fluid Interfaces

    SciTech Connect (OSTI)

    Orme, C A; Giocondi, J L

    2007-04-16T23:59:59.000Z

    Over the past decade there has been a natural drive to extend the investigation of dynamic surfaces in fluid environments to higher resolution characterization tools. Various aspects of solution crystal growth have been directly visualized for the first time. These include island nucleation and growth using transmission electron microscopy and scanning tunneling microscopy; elemental step motion using scanning probe microscopy; and the time evolution of interfacial atomic structure using various diffraction techniques. In this lecture we will discuss the use of one such in situ method, scanning probe microscopy, as a means of measuring surface dynamics during crystal growth and dissolution. We will cover both practical aspects of imaging such as environmental control, fluid flow, and electrochemical manipulation, as well as the types of physical measurements that can be made. Measurements such as step motion, critical lengths, nucleation density, and step fluctuations, will be put in context of the information they provide about mechanistic processes at surfaces using examples from metal and mineral crystal growth.

  17. Sandia National Laboratories: scanning tunneling microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    focus on stainless steels. Dr. An is an internationally recognized expert on scanning probe microscopy, such as atomic force microscopy and scanning ... Last Updated:...

  18. Detection of secondary phases in duplex stainless steel by magnetic force microscopy and scanning Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Ramírez-Salgado, J. [Instituto Mexicano del Petróleo, Dirección de Investigación y Posgrado, Eje Central Norte Lázaro Cárdenas, No. 152, 07730 D.F., México (Mexico); Domínguez-Aguilar, M.A., E-mail: madoming@imp.mx [Instituto Mexicano del Petróleo, Dirección de Investigación y Posgrado, Eje Central Norte Lázaro Cárdenas, No. 152, 07730 D.F., México (Mexico); Castro-Domínguez, B. [University of Tokyo, Department of Chemical System Engineering, Faculty of Engineering Bldg. 5, 7F 722, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113–8656 (Japan); Hernández-Hernández, P. [Instituto Mexicano del Petróleo, Dirección de Investigación y Posgrado, Eje Central Norte Lázaro Cárdenas, No. 152, 07730 D.F., México (Mexico); Newman, R.C. [University of Toronto, Department of Chemical Engineering and Applied Chemistry, 200 College Street, Toronto M5S 3E5 (Canada)

    2013-12-15T23:59:59.000Z

    The secondary phase transformations in a commercial super duplex stainless steel were investigated by micro-chemical analyses and high resolution scanning probe microscopy. Energy dispersive X-ray and electron probe detected ferrite and austenite as well as secondary phases in unetched aged duplex stainless steel type 25Cr-7Ni-3Mo. Volta potential indicated that nitride and sigma appeared more active than ferrite, while secondary austenite and austenite presented a nobler potential. Reversal order in nobility is thought to be attributable to the potential ranking provided by oxide nature diversity as a result of secondary phase surface compositions on steel. After eutectoid transformation, secondary austenite was detected by electron probe microanalysis, whereas atomic force microscopy distinguished this phase from former austenite by image contrast. Magnetic force microscopy revealed a “ghosted” effect on the latter microstructure probably derived from metal memory reminiscence of mechanical polishing at passivity and long range magnetic forces of ferrite phase. - Highlights: • Nobility detection of secondary phases by SKPFM in DSS particles is not a straightforward procedure. • As Volta potential and contrast are not always consistent SKPFM surface oxides is thought played an important role in detection. • AFM distinguished secondary austenite from former austenite by image contrast though SEM required EPMA.

  19. Scanning Hall Probe Microscopy of Magnetic Vortices inVery Underdoped yttrium-barium-copper-oxide

    SciTech Connect (OSTI)

    Guikema, Janice Wynn; /SLAC, SSRL

    2005-12-02T23:59:59.000Z

    Since their discovery by Bednorz and Mueller (1986), high-temperature cuprate superconductors have been the subject of intense experimental research and theoretical work. Despite this large-scale effort, agreement on the mechanism of high-T{sub c} has not been reached. Many theories make their strongest predictions for underdoped superconductors with very low superfluid density n{sub s}/m*. For this dissertation I implemented a scanning Hall probe microscope and used it to study magnetic vortices in newly available single crystals of very underdoped YBa{sub 2}Cu{sub 3}O{sub 6+x} (Liang et al. 1998, 2002). These studies have disproved a promising theory of spin-charge separation, measured the apparent vortex size (an upper bound on the penetration depth {lambda}{sub ab}), and revealed an intriguing phenomenon of ''split'' vortices. Scanning Hall probe microscopy is a non-invasive and direct method for magnetic field imaging. It is one of the few techniques capable of submicron spatial resolution coupled with sub-{Phi}{sub 0} (flux quantum) sensitivity, and it operates over a wide temperature range. Chapter 2 introduces the variable temperature scanning microscope and discusses the scanning Hall probe set-up and scanner characterizations. Chapter 3 details my fabrication of submicron GaAs/AlGaAs Hall probes and discusses noise studies for a range of probe sizes, which suggest that sub-100 nm probes could be made without compromising flux sensitivity. The subsequent chapters detail scanning Hall probe (and SQUID) microscopy studies of very underdoped YBa{sub 2}Cu{sub 3}O{sub 6+x} crystals with T{sub c} {le} 15 K. Chapter 4 describes two experimental tests for visons, essential excitations of a spin-charge separation theory proposed by Senthil and Fisher (2000, 2001b). We searched for predicted hc/e vortices (Wynn et al. 2001) and a vortex memory effect (Bonn et al. 2001) with null results, placing upper bounds on the vison energy inconsistent with the theory. Chapter 5 discusses imaging of isolated vortices as a function of T{sub c}. Vortex images were fit with theoretical magnetic field profiles in order to extract the apparent vortex size. The data for the lowest T{sub c}'s (5 and 6.5 K) show some inhomogeneity and suggest that {lambda}{sub ab} might be larger than predicted by the T{sub c} {proportional_to} n{sub s}(0)/m* relation first suggested by results of Uemura et al. (1989) for underdoped cuprates. Finally, Chapter 6 examines observations of apparent ''partial vortices'' in the crystals. My studies of these features indicate that they are likely split pancake vortex stacks. Qualitatively, these split stacks reveal information about pinning and anisotropy in the samples. Collectively these magnetic imaging studies deepen our knowledge of cuprate superconductivity, especially in the important regime of low superfluid density.

  20. Strain variations in InGaAsP/InGaP superlattices studied by scanning probe microscopy

    E-Print Network [OSTI]

    Feenstra, Randall

    1 Strain variations in InGaAsP/InGaP superlattices studied by scanning probe microscopy Huajie Chen, Kista, Sweden Abstract Strain-compensated InGaAsP/InGaP superlattices are studied in cross- section. The strain compensated InGaAsP/InGaP/InP superlattices studied here have application for light sources

  1. Introduction to Scanning Microwave Microscopy Mode

    E-Print Network [OSTI]

    Anlage, Steven

    Wenhai Han Introduction to Scanning Microwave Microscopy Mode Application Note Introduction Mapping through" and meanwhile achieve sufficient sensitivity and resolution. With the invention of scanning been developed to probe materials properties. These include scanning near-field to scanning microwave

  2. Bioelectrical SPMs (G. Gomila, UB-IBEC) Bioelectric Scanning Probe Microscopies

    E-Print Network [OSTI]

    Ritort, Felix

    -Surface Topography 900nm E.Coli Bacterium E.Coli Bacterium AFM Topography (2D colour image) 3D image measure with an SPM? 2-In addition to topography some other physical property depending on the type of SPM are softer. Topography Bioelectrical SPMs (G. Gomila, UB-IBEC) 1. Introduction Bioelectric scanning probe

  3. Ultrafast scanning tunneling microscopy

    SciTech Connect (OSTI)

    Botkin, D.A. [California Univ., Berkeley, CA (United States). Dept. of Physics]|[Lawrence Berkeley Lab., CA (United States)

    1995-09-01T23:59:59.000Z

    I have developed an ultrafast scanning tunneling microscope (USTM) based on uniting stroboscopic methods of ultrafast optics and scanned probe microscopy to obtain nanometer spatial resolution and sub-picosecond temporal resolution. USTM increases the achievable time resolution of a STM by more than 6 orders of magnitude; this should enable exploration of mesoscopic and nanometer size systems on time scales corresponding to the period or decay of fundamental excitations. USTM consists of a photoconductive switch with subpicosecond response time in series with the tip of a STM. An optical pulse from a modelocked laser activates the switch to create a gate for the tunneling current, while a second laser pulse on the sample initiates a dynamic process which affects the tunneling current. By sending a large sequence of identical pulse pairs and measuring the average tunnel current as a function of the relative time delay between the pulses in each pair, one can map the time evolution of the surface process. USTM was used to measure the broadband response of the STM`s atomic size tunnel barrier in frequencies from tens to hundreds of GHz. The USTM signal amplitude decays linearly with the tunnel junction conductance, so the spatial resolution of the time-resolved signal is comparable to that of a conventional STM. Geometrical capacitance of the junction does not appear to play an important role in the measurement, but a capacitive effect intimately related to tunneling contributes to the measured signals and may limit the ultimate resolution of the USTM.

  4. Largely defocused probe scanning transmission electron microscopy for imaging local modulation of strain field in a hetero interface

    SciTech Connect (OSTI)

    Kim, Suhyun, E-mail: u98kim@surface.phys.titech.ac.jp; Jung, Younheum; Kim, Joong Jung; Lee, Sunyoung; Lee, Haebum [Memory Analysis Science and Engineering Group, Samsung Electronics, San #16 Hwasung-City, Gyeonggi-Do 445-701 (Korea, Republic of); Oshima, Yoshifumi [School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1292 (Japan)

    2014-10-13T23:59:59.000Z

    We present an innovative method for characterizing the strain field in three dimensions in a hetero interface. Largely defocused probe scanning transmission electron microscopy (LDP-STEM) was employed for imaging the inhomogeneous strain field in a germanium (Ge) layer deposited on a silicon (Si) substrate. In the LDP-STEM image, Ge-atomic columns that are relaxed or strained to the Si substrate in the Si/Ge hetero interface were observed to be distinguishable, allowing for the qualitative characterization of the coherency of the crystal growth. Our results revealed that the strain field is locally modulated along the in-plane direction in the Si/Ge hetero interface.

  5. Photothermal imaging scanning microscopy

    DOE Patents [OSTI]

    Chinn, Diane (Pleasanton, CA); Stolz, Christopher J. (Lathrop, CA); Wu, Zhouling (Pleasanton, CA); Huber, Robert (Discovery Bay, CA); Weinzapfel, Carolyn (Tracy, CA)

    2006-07-11T23:59:59.000Z

    Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.

  6. Probing Heterogeneous Chemistry of Individual Atmospheric Particles Using Scanning Electron Microscopy and Energy-Dispersive X-ray Analysis

    SciTech Connect (OSTI)

    Krueger, Brenda J.; Grassian, Vicki H.; Iedema, Martin J.; Cowin, James P.; Laskin, Alexander

    2003-10-01T23:59:59.000Z

    In this paper, we demonstrate the utility of single-particle analysis to investigate the chemistry of isolated, individual particles of atmospheric relevance such as NaCl, sea salt, CaCO3, and SiO2. A variety of state-of-th-art scanning electron microscopy techniques, including environmental scanning electon microscopy and computer-controlled scanning electron microscopy/energy-dispersive X-ray analysis, were utilized for monitoring and quantifying phase transitions of individual particles, morphology, and compositional changes of individual particles as they react with nitric acid.

  7. Role of pseudospin in quasiparticle interferences in epitaxial probed by high resolution scanning tunneling microscopy

    E-Print Network [OSTI]

    Boyer, Edmond

    Role of pseudospin in quasiparticle interferences in epitaxial graphene, probed by high resolution of freedom emerging in graphene as a direct consequence of its honeycomb atomic structure, is responsible to provide a clear understanding of how such graphene's pseudospin impacts the quasiparticle interferences

  8. Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen; Kalinin, Sergei V; Nikiforov, Maxim P

    2013-07-09T23:59:59.000Z

    An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.

  9. INFLUENCE OF FILM STRUCTURE AND LIGHT ON CHARGE TRAPPING AND DISSIPATION DYNAMICS IN SPUN-CAST ORGANIC THIN-FILM TRANSISTORS MEASURED BY SCANNING KELVIN PROBE MICROSCOPY

    SciTech Connect (OSTI)

    Teague, L.; Moth, M.; Anthony, J.

    2012-05-03T23:59:59.000Z

    Herein, time-dependent scanning Kelvin probe microscopy of solution processed organic thin film transistors (OTFTs) reveals a correlation between film microstructure and OTFT device performance with the location of trapped charge within the device channel. The accumulation of the observed trapped charge is concurrent with the decrease in I{sub SD} during operation (V{sub G}=-40 V, V{sub SD}= -10 V). We discuss the charge trapping and dissipation dynamics as they relate to the film structure and show that application of light quickly dissipates the observed trapped charge.

  10. Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis

    SciTech Connect (OSTI)

    Wirtz, Tom; Fleming, Yves; Gerard, Mathieu [Department 'Science and Analysis of Materials' (SAM), Centre de Recherche Public, Gabriel Lippmann, 41 rue du Brill, L-4422 Belvaux (Luxembourg); Gysin, Urs; Glatzel, Thilo; Meyer, Ernst [Department of Physics, Universitaet Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland); Wegmann, Urs [Department of Physics, Universitaet Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland); Ferrovac GmbH, Thurgauerstr. 72, CH-8050 Zuerich (Switzerland); Maier, Urs [Ferrovac GmbH, Thurgauerstr. 72, CH-8050 Zuerich (Switzerland); Odriozola, Aitziber Herrero; Uehli, Daniel [SPECS Zurich GmbH, Technoparkstr. 1, CH-8005 Zuerich (Switzerland)

    2012-06-15T23:59:59.000Z

    State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical mappings with excellent sensitivity and spatial resolution. Several important artifacts however arise from the fact that SIMS 3D mapping does not take into account the surface topography of the sample. In order to correct these artifacts, we have integrated a specially developed scanning probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new high-precision sample stage, a scanner with a range of 100 {mu}m in x and y direction, and a dedicated SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy modes. Topographical information gained from AFM measurements taken before, during, and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D reconstruction using the software program 'SARINA,' which was developed for this first combined SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMS-SPM approach.

  11. Scanning electron microscopy of cold gases

    E-Print Network [OSTI]

    Santra, Bodhaditya

    2015-01-01T23:59:59.000Z

    Ultracold quantum gases offer unique possibilities to study interacting many-body quantum systems. Probing and manipulating such systems with ever increasing degree of control requires novel experimental techniques. Scanning electron microscopy is a high resolution technique which can be used for in situ imaging, single site addressing in optical lattices and precision density engineering. Here, we review recent advances and achievements obtained with this technique and discuss future perspectives.

  12. Characterization of power induced heating and damage in fiber optic probes for near-field scanning optical microscopy

    E-Print Network [OSTI]

    Dickenson, Nicholas E.; Erickson, Elizabeth S.; Mooren, Olivia L.; Dunn, Robert C.

    2007-04-07T23:59:59.000Z

    ;m. These stress fractures, arising from the differential heating expansion of the dielectric and the metal coating, eventually lead to coating removal and probe failure. For etched tips, the absence of clear stress fractures and the pooled morphology... the aperture, light is lost into the surrounding metal coating of the probe. This leads to the two related phenomena of tip heating and failure, the characterization of which have been problematic due to the small size of the probe.3,7,8 However, understanding...

  13. Scanning Transmission Electron Microscopy for Nanostructure

    E-Print Network [OSTI]

    Pennycook, Steve

    152 6 Scanning Transmission Electron Microscopy for Nanostructure Characterization S. J. Pennycook. Introduction The scanning transmission electron microscope (STEM) is an invaluable tool atom. The STEM works on the same principle as the normal scanning electron microscope (SEM), by forming

  14. Scanning Tunneling Microscopy currents on locally disordered graphene

    E-Print Network [OSTI]

    Tsai, Shan-Wen; Peres, Nuno M. R.; Santos, J. E.; Ribeiro, R. M.

    2009-01-01T23:59:59.000Z

    Scanning Tunneling Microscopy currents on locally disorderedcharacteristic curves of Scanning Tunneling Microscopy (STM)for the calculation of Scanning Tunneling Microscopy (STM)

  15. Massively Parallel Scanning Probe Nanolithography Daniel J. Arbuckle and Aristides A. G. Requicha

    E-Print Network [OSTI]

    Southern California, University of

    Massively Parallel Scanning Probe Nanolithography Daniel J. Arbuckle and Aristides A. G. Requicha on Scanning Probe Microscopy (SPM) are sequential, and therefore have a low throughput. This paper discusses are presented to validate the approach. Keywords-Nanorobotics, Scanning Probe Microscopy (SPM), Multi-Tip SPM

  16. Development of a microfluidic device for patterning multiple species by scanning probe lithography

    E-Print Network [OSTI]

    Rivas Cardona, Juan Alberto

    2009-06-02T23:59:59.000Z

    Scanning Probe Lithography (SPL) is a versatile nanofabrication platform that leverages microfluidic “ink” delivery systems with Scanning Probe Microscopy (SPM) for generating surface-patterned chemical functionality on the sub-100 nm length scale...

  17. Scanning Probe AFM Compound Microscope | EMSL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probe AFM Compound Microscope Scanning Probe AFM Compound Microscope The atomic force microscope (AFM) compound microscope is designed primarily for fluorescence imaging in the...

  18. Scanning acoustic microscopy for mapping the microstructure of soft materials

    E-Print Network [OSTI]

    N. G. Parker; M. J. W. Povey

    2009-04-30T23:59:59.000Z

    Acoustics provides a powerful modality with which to 'see' the mechanical properties of a wide range of elastic materials. It is particularly adept at probing soft materials where excellent contrast and propagation distance can be achieved. We have constructed a scanning acoustic microscope capable of mapping the microstructure of such materials. We review the general principles of scanning acoustic microscopy and present new examples of its application in imaging biological matter, industrial materials and particulate systems.

  19. Fast scanning two-photon microscopy

    E-Print Network [OSTI]

    Chang, Jeremy T

    2010-01-01T23:59:59.000Z

    Fast scanning two-photon microscopy coupled with the use light activated ion channels provides the basis for fast imaging and stimulation in the characterization of in vivo neural networks. A two-photon microscope capable ...

  20. Scanning Transmission Electron Microscopy Investigations of Complex...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of...

  1. Scanning transmission x-ray microscopy of isolated multiwall carbon A. Felten,a

    E-Print Network [OSTI]

    Hitchcock, Adam P.

    Scanning transmission x-ray microscopy of isolated multiwall carbon nanotubes A. Felten,a H. Hody September 2006 Scanning transmission x-ray microscopy STXM has been used to study isolated carbon nanotubes- cations including biological and chemical sensors, nanoelec- tronic devices, tips for scanning probe

  2. Scanning photovoltage microscopy of potential modulations in carbon Marcus Freitag,a

    E-Print Network [OSTI]

    Liu, Jie

    Scanning photovoltage microscopy of potential modulations in carbon nanotubes Marcus Freitag to understand their role in ac- tive devices. Here we use scanning photovoltage microscopy to probe the built. Scanning the laser laterally produces a moving potential step that is capable of inducing a photovoltage

  3. NEAR-FIELD SCANNING MICROWAVE MICROSCOPY: MEASURING LOCAL MICROWAVE PROPERTIES AND ELECTRIC FIELD DISTRIBUTIONS

    E-Print Network [OSTI]

    Anlage, Steven

    WEIF-49 NEAR-FIELD SCANNING MICROWAVE MICROSCOPY: MEASURING LOCAL MICROWAVE PROPERTIES AND ELECTRIC>;ics, University of Maryland, College Park, MD 2OY@-4lll, USA Abstract We describe the near-field scanning methods of scanning probe microscopy have been developed. Generally spea- king one can divide

  4. Near-Field Scanning Optical Microscopy of Temperature-and Thickness-Dependent Morphology and

    E-Print Network [OSTI]

    Buratto, Steve

    Near-Field Scanning Optical Microscopy of Temperature- and Thickness-Dependent Morphology 21, 2000 We use near-field scanning optical microscopy (NSOM) to probe the local optical spectroscopy with bulk techniques such as differ- ential scanning calorimetry (DSC) and X-ray diffractom- etry

  5. Flash Scanning Electron Microscopy Raphael Sznitman, Aurelien Lucchi, Marco Cantoni,

    E-Print Network [OSTI]

    Dalang, Robert C.

    Flash Scanning Electron Microscopy Raphael Sznitman, Aurelien Lucchi, Marco Cantoni, Graham Knott. Scanning Electron Microscopy (SEM) is an invaluable tool for biologists and neuroscientists to study brain earlier methods, we explicitly balance the conflicting requirements of spending enough time scanning

  6. Near-field scanning optical microscopy as a simultaneous probe of fields and band structure of photonic crystals: A computational study

    E-Print Network [OSTI]

    Fan, Shanhui

    optical microscopy NSOM imaging to simultaneously obtain both the eigenfield distribution and the band

  7. Image Scanning Microscopy Claus B. Muller and Jorg Enderlein*

    E-Print Network [OSTI]

    Enderlein, Jörg

    Image Scanning Microscopy Claus B. Mu¨ller and Jo¨rg Enderlein* III. Institute of Physics, Georg microscopy technique is introduced, image scanning microscopy (ISM), which combines conventional confocal-laser scanning microscopy with fast wide-field CCD detection. The technique allows for doubling the lateral

  8. Scanning probe characterization of novel semiconductor materials and devices

    E-Print Network [OSTI]

    Zhou, Xiaotian

    2007-01-01T23:59:59.000Z

    InGaN/GaN quantum wells by scanning capacitance microscopywell heterostructures by scanning capacitance microscopy”InGaN/GaN quantum wells by scanning capacitance microscopy”

  9. In-Situ Transmission Electron Microscopy Probing of Native Oxide...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probing of Native Oxide and Artificial Layers on Silicon Nanoparticles for Lithium Ion In-Situ Transmission Electron Microscopy Probing of Native Oxide and Artificial...

  10. Vertically aligned nanostructure scanning probe microscope tips

    DOE Patents [OSTI]

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19T23:59:59.000Z

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  11. Scanning Probe Direct-Write of Germanium Nanostructures. | EMSL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Probe Direct-Write of Germanium Nanostructures. Scanning Probe Direct-Write of Germanium Nanostructures. Abstract: Bottom-up nanostructure synthesis has played a pivotal role in...

  12. Atom probe field ion microscopy and related topics: A bibliography 1989

    SciTech Connect (OSTI)

    Miller, M.K.; Hawkins, A.R.; Russell, K.F.

    1990-12-01T23:59:59.000Z

    This bibliography includes references related to the following topics: atom probe field ion microscopy (APFIM), field ion spectroscopy (FIM), field emission microscopy (FEM), liquid metal ion sources (LMIS), scanning tunneling microscopy (STM), and theory. Technique-orientated studies and applications are included. This bibliography covers the period 1989. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications.

  13. Scanning Tunneling Microscopy and Theoretical Study of Water...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    and Theoretical Study of Water Adsorption on Fe3O4: Implications for Catalysis. Scanning Tunneling Microscopy and Theoretical Study of Water Adsorption on Fe3O4: Implications...

  14. Scanning probe lithography of self-assembled monolayers Guohua Yang, Nabil A. Amro, Gang-yu Liu*

    E-Print Network [OSTI]

    Liu, Gang-yu

    Scanning probe lithography of self-assembled monolayers Guohua Yang, Nabil A. Amro, Gang-yu Liu* Department ofChemistry, University ofCalifornia, Davis, CA, USA 95616 ABSTRACT Systematic studies on scanning, and nanopen reader and writer (NPRW), which rely on the local force, and two scanning tunneling microscopy

  15. Development of a Scanning Probe Microscope and Studies of Graphene Grown on Copper

    E-Print Network [OSTI]

    Rasool, Haider Imad

    2012-01-01T23:59:59.000Z

    1: INTRODUCTION 1.1. BRIEF DISCUSSION OF SCANNING PROBEhighly stable electrochemical scanning probe microscope forincorporated it into a scanning probe microscope, performed

  16. Scanning X-ray Microscopy Investigations into the Electron Beam Exposure Mechanism of Hydrogen Silsesquioxane Resists

    E-Print Network [OSTI]

    Olynick, Deirdre L.; Tivanski, Alexei V.; Gilles, Mary K.; Tyliszczak, Tolek; Salmassi, Farhad; Liddle, J. Alexander

    2006-01-01T23:59:59.000Z

    Scanning X-ray Microscopy Investigations into the Electronchemistry is investigated by Scanning Transmission X-raythe area exposed. 15 Recently, scanning transmission x-ray

  17. Controlled Manipulation of Nanoparticles : Scanning Probe Measurements and Modelling of Trajectories

    E-Print Network [OSTI]

    Amrhein, Valentin

    Controlled Manipulation of Nanoparticles : Scanning Probe Measurements and Modelling on the manipulation of Au nanoparticles. A new technique for controlled manipulation of nanospheres and asymmetric, is a common experience in atomic force microscopy (AFM). Understanding how to control and turn this effect

  18. Scanning electron microscopy imaging of hydraulic cement microstructure

    E-Print Network [OSTI]

    Bentz, Dale P.

    Scanning electron microscopy imaging of hydraulic cement microstructure by Paul Stutzman Building Reprinted from Cement and Concrete Composites, Vol. 26, No. 8, 957-966 pp., November 2004. NOTE: This paper;Available online at www.sciencedirect.com SCIENCE@OIRECT@ Cement & Concrete CompositesELSEVIER Cement

  19. DOI: 10.1002/adma.200800742 Scanning Photoemission Microscopy of

    E-Print Network [OSTI]

    Kim, Sehun

    DOI: 10.1002/adma.200800742 Scanning Photoemission Microscopy of Graphene Sheets on SiO2** By Ki in extracting individual sheets of carbon atoms (graphene) from graphite crystals, graphene has been attracted metals or molecules.[4­6] In addition, the modification of graphene surfaces using a direct chemical

  20. Surface Science Letters Scanning tunneling microscopy study of the anatase

    E-Print Network [OSTI]

    Diebold, Ulrike

    ; Surface structure, morphology, roughness, and topography; Low index single crystal surfaces The structureSurface Science Letters Scanning tunneling microscopy study of the anatase (1 0 0) surface NancyO2 anatase (1 0 0) surface. Natural single crystals of anatase were employed; and after several

  1. Radio-frequency scanning tunnelling microscopy U. Kemiktarak1

    E-Print Network [OSTI]

    LETTERS Radio-frequency scanning tunnelling microscopy U. Kemiktarak1 , T. Ndukum3 , K. C. Schwab3 measurementsinmesoscopicelectronicsandmechanics. Broadband noise measurements across the tunnel junction using this radio-frequency STM available from nanoscale optical and electrical displacement detection tech- niques, and the radio

  2. Modulated microwave microscopy and probes used therewith

    DOE Patents [OSTI]

    Lai, Keji; Kelly, Michael; Shen, Zhi-Xun

    2012-09-11T23:59:59.000Z

    A microwave microscope including a probe tip electrode vertically positionable over a sample and projecting downwardly from the end of a cantilever. A transmission line connecting the tip electrode to the electronic control system extends along the cantilever and is separated from a ground plane at the bottom of the cantilever by a dielectric layer. The probe tip may be vertically tapped near or at the sample surface at a low frequency and the microwave signal reflected from the tip/sample interaction is demodulated at the low frequency. Alternatively, a low-frequency electrical signal is also a non-linear electrical element associated with the probe tip to non-linearly interact with the applied microwave signal and the reflected non-linear microwave signal is detected at the low frequency. The non-linear element may be semiconductor junction formed near the apex of the probe tip or be an FET formed at the base of a semiconducting tip.

  3. Dynamic study of tunable stiffness scanning microscope probe

    E-Print Network [OSTI]

    Vega González, Myraida Angélica

    2005-01-01T23:59:59.000Z

    This study examines the dynamic characteristics of the in-plane tunable stiffness scanning microscope probe for an atomic force microscope (AFM). The analysis was carried out using finite element analysis (FEA) methods for ...

  4. Phase modulation mode of scanning ion conductance microscopy

    SciTech Connect (OSTI)

    Li, Peng; Zhang, Changlin [State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016 (China); University of Chinese Academy of Sciences, Beijing 100049 (China); Liu, Lianqing, E-mail: lqliu@sia.cn, E-mail: gli@engr.pitt.edu; Wang, Yuechao; Yang, Yang [State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016 (China); Li, Guangyong, E-mail: lqliu@sia.cn, E-mail: gli@engr.pitt.edu [Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania 15261 (United States)

    2014-08-04T23:59:59.000Z

    This Letter reports a phase modulation (PM) mode of scanning ion conductance microscopy. In this mode, an AC current is directly generated by an AC voltage between the electrodes. The portion of the AC current in phase with the AC voltage, which is the current through the resistance path, is modulated by the tip-sample distance. It can be used as the input of feedback control to drive the scanner in Z direction. The PM mode, taking the advantages of both DC mode and traditional AC mode, is less prone to electronic noise and DC drift but maintains high scanning speed. The effectiveness of the PM mode has been proven by experiments.

  5. Scanning Probe AFM Compound Microscope | EMSL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    a dye-sensitization system,... Tip-Enhanced Near-Field Raman Spectroscopy Probing Single Dye-Sensitized TiO2 Nanoparticles. The correlated metallic tip-enhanced Raman spectroscopy...

  6. Scanning Josephson Tunneling Microscopy of Single Crystal Bi2Sr2CaCu2O8+delta with a Conventional Superconducting Tip

    E-Print Network [OSTI]

    Kimura, H.

    2010-01-01T23:59:59.000Z

    Title) Scanning Josephson Tunneling Microscopy of Singlea conventional superconducting scanning tunneling microscopeabstract} (Body) Remarkable scanning tunneling microscopy (

  7. Scanning Force Microscopy Studies on Molecular Packing and Friction Anisotropy in Thin Films of

    E-Print Network [OSTI]

    Kenis, Paul J. A.

    Scanning Force Microscopy Studies on Molecular Packing and Friction Anisotropy in Thin Films in bulk, was studied using differential scanning calorimetry, optical microscopy, magic angle solid were investigated at the molecular level by a combination of multimode scanning force microscopy (SFM

  8. Scanning microscopy using a short-focal-length Fresnel zone plate

    E-Print Network [OSTI]

    Scanning microscopy using a short-focal-length Fresnel zone plate Ethan Schonbrun,* Winnie N. Ye demonstrate a form of scanning microscopy using a short-focal-length Fresnel zone plate and a low-NA relay. In this scheme, parallel scanning microscopy using a Fresnel zone-plate array would require only a single spatial

  9. Probing graphene defects and estimating graphene quality with optical microscopy

    SciTech Connect (OSTI)

    Lai, Shen [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Center for Human Interface Nanotechnology (HINT), Suwon 440-746 (Korea, Republic of); Kyu Jang, Sung [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Jae Song, Young, E-mail: yjsong@skku.edu [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Department of Physics, Sungkyunkwan University (SKKU), Suwon 440-746 (Korea, Republic of); Lee, Sungjoo, E-mail: leesj@skku.edu [SKKU Advanced Institute of Nanotechnology (SAINT), Suwon 440-746 (Korea, Republic of); Center for Human Interface Nanotechnology (HINT), Suwon 440-746 (Korea, Republic of); College of Information and Communication Engineering, Sungkyunkwan University (SKKU), Suwon 440-746 (Korea, Republic of)

    2014-01-27T23:59:59.000Z

    We report a simple and accurate method for detecting graphene defects that utilizes the mild, dry annealing of graphene/Cu films in air. In contrast to previously reported techniques, our simple approach with optical microscopy can determine the density and degree of dislocation of defects in a graphene film without inducing water-related damage or functionalization. Scanning electron microscopy, confocal Raman and atomic force microscopy, and X-ray photoelectron spectroscopy analysis were performed to demonstrate that our nondestructive approach to characterizing graphene defects with optimized thermal annealing provides rapid and comprehensive determinations of graphene quality.

  10. Scanning Gate Spectroscopy and Its Application to Carbon Nanotube Defects

    E-Print Network [OSTI]

    Collins, Philip G

    2011-01-01T23:59:59.000Z

    24) Sarid, D. Exploring Scanning Probe Microscopy withS. V. ; Gruverman, A. Scanning probe microscopy: electricalLETTER pubs.acs.org/NanoLett Scanning Gate Spectroscopy and

  11. Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research

    SciTech Connect (OSTI)

    Moffet, Ryan C.; Tivanski, Alexei V.; Gilles, Mary K.

    2011-01-20T23:59:59.000Z

    Scanning transmission x-ray microscopy (STXM) combines x-ray microscopy and near edge x-ray absorption fine structure spectroscopy (NEXAFS). This combination provides spatially resolved bonding and oxidation state information. While there are reviews relevant to STXM/NEXAFS applications in other environmental fields (and magnetic materials) this chapter focuses on atmospheric aerosols. It provides an introduction to this technique in a manner approachable to non-experts. It begins with relevant background information on synchrotron radiation sources and a description of NEXAFS spectroscopy. The bulk of the chapter provides a survey of STXM/NEXAFS aerosol studies and is organized according to the type of aerosol investigated. The purpose is to illustrate the current range and recent growth of scientific investigations employing STXM-NEXAFS to probe atmospheric aerosol morphology, surface coatings, mixing states, and atmospheric processing.

  12. Characterization of two-dimensional hexagonal boron nitride using scanning electron and scanning helium ion microscopy

    SciTech Connect (OSTI)

    Guo, Hongxuan, E-mail: Guo.hongxuan@nims.go.jp, E-mail: msxu@zju.edu.cn [Global Research Center for Environment and Energy Based on Nanomaterials Science National Institute for Materials Science (NIMS) 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan); Gao, Jianhua; Ishida, Nobuyuki [International Center for Young Scientists, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan); Xu, Mingsheng, E-mail: Guo.hongxuan@nims.go.jp, E-mail: msxu@zju.edu.cn [State Key Laboratory of Silicon Materials, Key Laboratory of Macromolecular Synthesis and Functionalization, Department of Polymer Science and Engineering, Zhejiang University, Hangzhou 310027 (China); Fujita, Daisuke [Advanced Key Technologies Division, Global Research Center for Environment and Energy Based on Nanomaterials Science, and International Center for Young Scientists, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)

    2014-01-20T23:59:59.000Z

    Characterization of the structural and physical properties of two-dimensional (2D) materials, such as layer number and inelastic mean free path measurements, is very important to optimize their synthesis and application. In this study, we characterize the layer number and morphology of hexagonal boron nitride (h-BN) nanosheets on a metallic substrate using field emission scanning electron microscopy (FE-SEM) and scanning helium ion microscopy (HIM). Using scanning beams of various energies, we could analyze the dependence of the intensities of secondary electrons on the thickness of the h-BN nanosheets. Based on the interaction between the scanning particles (electrons and helium ions) and h-BN nanosheets, we deduced an exponential relationship between the intensities of secondary electrons and number of layers of h-BN. With the attenuation factor of the exponential formula, we calculate the inelastic mean free path of electrons and helium ions in the h-BN nanosheets. Our results show that HIM is more sensitive and consistent than FE-SEM for characterizing the number of layers and morphology of 2D materials.

  13. Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series

    SciTech Connect (OSTI)

    Dahmen, Tim [German Research Center for Artificial Intelligence (DFKI), Germany] [German Research Center for Artificial Intelligence (DFKI), Germany; Baudoin, Jean-Pierre G [ORNL] [ORNL; Lupini, Andrew R [ORNL] [ORNL; Kubel, Christian [Karlsruhe Institute of Technology, Leopoldshafen, Germany] [Karlsruhe Institute of Technology, Leopoldshafen, Germany; Slusallek, Phillip [German Research Center for Artificial Intelligence (DFKI), Germany] [German Research Center for Artificial Intelligence (DFKI), Germany; De Jonge, Niels [ORNL] [ORNL

    2014-01-01T23:59:59.000Z

    In this study, a combined tilt- and focal series is proposed as a new recording scheme for high-angle annular dark-field scanning transmission electron microscopy (STEM) tomography. Three-dimensional (3D) data were acquired by mechanically tilting the specimen, and recording a through-focal series at each tilt direction. The sample was a whole-mount macrophage cell with embedded gold nanoparticles. The tilt focal algebraic reconstruction technique (TF-ART) is introduced as a new algorithm to reconstruct tomograms from such combined tilt- and focal series. The feasibility of TF-ART was demonstrated by 3D reconstruction of the experimental 3D data. The results were compared with a conventional STEM tilt series of a similar sample. The combined tilt- and focal series led to smaller missing wedge artifacts, and a higher axial resolution than obtained for the STEM tilt series, thus improving on one of the main issues of tilt series-based electron tomography.

  14. Direct determination of the local Hamaker constant of inorganic surfaces based on scanning force microscopy

    SciTech Connect (OSTI)

    Krajina, Brad A.; Kocherlakota, Lakshmi S.; Overney, René M., E-mail: roverney@u.washington.edu [Department of Chemical Engineering, University of Washington, Seattle, Washington 98195-1750 (United States)

    2014-10-28T23:59:59.000Z

    The energetics involved in the bonding fluctuations between nanometer-sized silicon dioxide (SiO{sub 2}) probes and highly oriented pyrolytic graphite (HOPG) and molybdenum disulfide (MoS{sub 2}) could be quantified directly and locally on the submicron scale via a time-temperature superposition analysis of the lateral forces between scanning force microscopy silicon dioxide probes and inorganic sample surfaces. The so-called “intrinsic friction analysis” (IFA) provided direct access to the Hamaker constants for HOPG and MoS{sub 2}, as well as the control sample, calcium fluoride (CaF{sub 2}). The use of scanning probe enables nanoscopic analysis of bonding fluctuations, thereby overcoming challenges associated with larger scale inhomogeneity and surface roughness common to conventional techniques used to determine surface free energies and dielectric properties. A complementary numerical analysis based on optical and electron energy loss spectroscopy and the Lifshitz quantum electrodynamic theory of van der Waals interactions is provided and confirms quantitatively the IFA results.

  15. Scanning near-field optical microscopy based on the heterodyne phase-controlled oscillator method

    E-Print Network [OSTI]

    Texas at Austin. University of

    Scanning near-field optical microscopy based on the heterodyne phase-controlled oscillator method G and quality factor of the tip oscillations was used to control the scanning near-field optical microscope SNOM0021-8979 00 04017-2 I. INTRODUCTION Scanning near-field optical microscopy SNOM is in- creasingly

  16. Amyloid Structure and Assembly: Insights from Scanning Transmission Electron Microscopy

    SciTech Connect (OSTI)

    Goldsbury, C.; Wall, J.; Baxa, U.; Simon, M. N.; Steven, A. C.; Engel, A.; Aebi, U.; Muller, S. A.

    2011-01-01T23:59:59.000Z

    Amyloid fibrils are filamentous protein aggregates implicated in several common diseases such as Alzheimer's disease and type II diabetes. Similar structures are also the molecular principle of the infectious spongiform encephalopathies such as Creutzfeldt-Jakob disease in humans, scrapie in sheep, and of the so-called yeast prions, inherited non-chromosomal elements found in yeast and fungi. Scanning transmission electron microscopy (STEM) is often used to delineate the assembly mechanism and structural properties of amyloid aggregates. In this review we consider specifically contributions and limitations of STEM for the investigation of amyloid assembly pathways, fibril polymorphisms and structural models of amyloid fibrils. This type of microscopy provides the only method to directly measure the mass-per-length (MPL) of individual filaments. Made on both in vitro assembled and ex vivo samples, STEM mass measurements have illuminated the hierarchical relationships between amyloid fibrils and revealed that polymorphic fibrils and various globular oligomers can assemble simultaneously from a single polypeptide. The MPLs also impose strong constraints on possible packing schemes, assisting in molecular model building when combined with high-resolution methods like solid-state nuclear magnetic resonance (NMR) and electron paramagnetic resonance (EPR).

  17. An Scanning Tunneling Microscopy and Photoelectron Spectroscopy Study of Pattern Formation and Molecule Ordering under a Variety of Interactions

    E-Print Network [OSTI]

    Zhu, Yeming

    2013-01-01T23:59:59.000Z

    Chen, Introduction to Scanning Tunneling Microscopy, Oxfordvoltages to search the scanning area on the surface. Threecontrol system for scanning tun- neling microscope (STM)

  18. Integration of Ion Implantation with Scanning ProbeAlignment

    SciTech Connect (OSTI)

    Persaud, A.; Rangelow, I.W.; Schenkel, T.

    2005-03-01T23:59:59.000Z

    We describe a scanning probe instrument which integrates ion beams with imaging and alignment functions of a piezo resistive scanning probe in high vacuum. Energetic ions (1 to a few hundred keV) are transported through holes in scanning probe tips [1]. Holes and imaging tips are formed by Focused Ion Beam (FIB) drilling and ion beam assisted thin film deposition. Transport of single ions can be monitored through detection of secondary electrons from highly charged dopant ions (e. g., Bi{sup 45+}) enabling single atom device formation. Fig. 1 shows SEM images of a scanning probe tip formed by ion beam assisted Pt deposition in a dual beam FIB. Ion beam collimating apertures are drilled through the silicon cantilever with a thickness of 5 {micro}m. Aspect ratio limitations preclude the direct drilling of holes with diameters well below 1 {micro}m, and smaller hole diameters are achieved through local thin film deposition [2]. The hole in Fig. 1 was reduced from 2 {micro}m to a residual opening of about 300 nm. Fig. 2 shows an in situ scanning probe image of an alignment dot pattern taken with the tip from Fig. 1. Transport of energetic ions through the aperture in the scanning probe tip allows formation of arbitrary implant patterns. In the example shown in Fig. 2 (right), a 30 nm thick PMMA resist layer on silicon was exposed to 7 keV Ar{sup 2+} ions with an equivalent dose of 10{sup 14} ions/cm{sup 2} to form the LBL logo. An exciting goal of this approach is the placement of single dopant ions into precise locations for integration of single atom devices, such as donor spin based quantum computers [3, 4]. In Fig. 3, we show a section of a micron size dot area exposed to a low dose (10{sup 11}/cm{sup 2}) of high charge state dopant ions. The Bi{sup 45+} ions (200 keV) were extracted from a low emittance highly charged ions source [5]. The potential energy of B{sup 45+}, i. e., the sum of the binding energies required to remove the electrons, amounts to 36 keV. This energy is deposited within {approx}10 fs when an ion impinges on a target. The highly localized energy deposition results in efficient resist exposure, and is associated with strongly enhanced secondary electron emission, which allows monitoring of single ion impacts [4]. The ex situ scanning probe image with line scan in Fig. 3 shows a single ion impact site in PMMA (after standard development). In our presentation, we will discuss resolution requirements for ion placement in prototype quantum computer structures [3] with respect to resolution limiting factors in ion implantation with scanning probe alignment.

  19. The Ultra-High Vacuum, Low-Temperature Scanning Probe Microscope...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The Ultra-High Vacuum, Low-Temperature Scanning Probe Microscope in EMSL's Quiet Wing The Ultra-High Vacuum, Low-Temperature Scanning Probe Microscope in EMSL's Quiet Wing This is...

  20. An Advanced Ultra-Low Temperature Scanning Probe Microscope

    E-Print Network [OSTI]

    An Advanced Ultra-Low Temperature Scanning Probe Microscope P R O J E C T L E A D E R : Joseph); Steven Blankenship, Alan Band (NIST) G O A L To develop an ultra-high vacuum, ultra-low temperature, high of subpicometer stability and can operate in ultra-high vacuum at 10 mK, and in magnetic fields up to 15 T

  1. Laser-Scanning Coherent Anti-Stokes Raman Scattering Microscopy and Applications to Cell Biology

    E-Print Network [OSTI]

    Xie, Xiaoliang Sunney

    Laser-Scanning Coherent Anti-Stokes Raman Scattering Microscopy and Applications to Cell Biology Ji 11747-3157 USA ABSTRACT Laser-scanning coherent anti-Stokes Raman scattering (CARS) microscopy with fast., 1990). Duncan et al. constructed the first CARS microscope by use of two dye laser beams

  2. ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE-EDGE SCANNING MICROSCOPY

    E-Print Network [OSTI]

    Keyser, John

    ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE- EDGE SCANNING MICROSCOPY A Thesis Science #12;ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE- EDGE SCANNING MICROSCOPY A Thesis) ______________________________ ______________________________ Ergun Akleman Valerie Taylor (Member) (Head of Department) December 2003 Major Subject: Computer Science

  3. A Method for Measuring Cerebral Blood Volume of Mouse using Multiphoton Laser Scanning Microscopy

    E-Print Network [OSTI]

    Vial, Jean-Claude

    A Method for Measuring Cerebral Blood Volume of Mouse using Multiphoton Laser Scanning Microscopy P Joseph Fourier,Grenoble, France ABSTRACT Knowledge of the volume of blood per unit volume of brain tissue-photon laser scanning microscopy to obtain the local blood volume in the cortex of the anesthetized mouse. We

  4. Video-rate Scanning Confocal Microscopy and Microendoscopy

    E-Print Network [OSTI]

    Nichols, Alexander J.

    Confocal microscopy has become an invaluable tool in biology and the biomedical sciences, enabling rapid, high-sensitivity, and high-resolution optical sectioning of complex systems. Confocal microscopy is routinely used, ...

  5. Atom probe field ion microscopy and related topics: A bibliography 1992

    SciTech Connect (OSTI)

    Russell, K.F.; Godfrey, R.D.; Miller, M.K.

    1993-12-01T23:59:59.000Z

    This bibliography contains citations of books, conference proceedings, journals, and patents published in 1992 on the following types of microscopy: atom probe field ion microscopy (108 items); field emission microscopy (101 items); and field ion microscopy (48 items). An addendum of 34 items missed in previous bibliographies is included.

  6. SCANNING HALL PROBE MICROSCOPY OF SUPERCURRENTS IN YBCO FILMS

    E-Print Network [OSTI]

    Moler, Kathryn A.

    and reducing gears. It en- ables me to image an entire sample, then zoom in on regions of interest, down image two "coat- ed conductors"--YBCO grown on metal tape. I find relatively homogeneous flux

  7. Scanning probe microscopy of nucleic acids and thin organic films

    E-Print Network [OSTI]

    Marat Olegovich Gallyamov

    2011-04-24T23:59:59.000Z

    We developed the models and algorithms to describe two main artefacts of AFM: (i) broadening effect and (ii) decreased heights of profiles for individual objects adsorbed on a hard substrate. It was shown how to measure elastic properties of a single adsorbed microobject. From the viewpoint of contact deformation theory we analysed mechanism of AFM visualisation of an atomic (molecular) structure of a flat surface. We tested technique of immobilisation on a substrate for free single-stranded RNA molecules in an extended state. Using AFM we visualised stages of processes of RNA release from protein coat of tobacco mosaic virus particles. The asymmetry of this process regarding two ends of a macromolecule was confirmed. The dynamics of compaction for DNA T4 molecules was traced using AFM in real time regime. The partially compacted macromolecules were clearly resolved. We detected that the partially compacted structures consisted of toroidal parts formed by different macromolecular strands. The real geometry of the compacted structures was reconstructed on the basis of systematic AFM measurements. That allowed us to calculate the amount of molecules combining each condensed DNA particle. We demonstrated clear benefits of horizontal deposition method for formation of LB films. Using AFM we achieved molecular resolution for some thin film coating and detected lattice parameters with the precision determined by the errors within a few percent. We demonstrated that the structure of the film is determined by the concurrence of several factors: by the closest packing principle for hydrocarbon tails, by the values of surface areas of polar heads at water subphase as well as by the substrate influence.

  8. Band Excitation Method Applicable to Scanning Probe Microscopy - Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOE Office511041cloth DocumentationProductsAlternativeOperationalAugustDecade5-F,INITIAL JohnE P

  9. Iran Thomas Auditorium, 8600 Transport Measurements by Scanning Probe Microscopy:

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOEThe Bonneville PowerCherries 82981-1cnHigh SchoolIn12 Investigation Peer Review 2012IowaFebruary 9,January

  10. Scanning Probe Microscopy with Spectroscopic Molecular Recognition - Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level:Energy: Grid Integration Redefining What's PossibleRadiationImplementingnpitcheResearch Briefs TheSanket A.LittleFY13

  11. Manual-scanning optical coherence tomography probe based on position tracking

    E-Print Network [OSTI]

    Yang, Changhuei

    Manual-scanning optical coherence tomography probe based on position tracking Jian Ren,1, * Jigang to reconstruct images for a manual-scanning optical coherence tomog- raphy (OCT) probe is proposed's pose. The continuous device poses tracking, and the collected OCT depth scans can then be combined

  12. Imaging and quantitative data acquisition of biological cell walls with Atomic Force Microscopy and Scanning Acoustic Microscopy

    SciTech Connect (OSTI)

    Tittmann, B. R. [Penn State; Xi, X. [Penn State

    2014-09-01T23:59:59.000Z

    This chapter demonstrates the feasibility of Atomic Force Microscopy (AFM) and High Frequency Scanning Acoustic Microscopy (HF-SAM) as tools to characterize biological tissues. Both the AFM and the SAM have shown to provide imaging (with different resolution) and quantitative elasticity measuring abilities. Plant cell walls with minimal disturbance and under conditions of their native state have been examined with these two kinds of microscopy. After descriptions of both the SAM and AFM, their special features and the typical sample preparation is discussed. The sample preparation is focused here on epidermal peels of onion scales and celery epidermis cells which were sectioned for the AFM to visualize the inner surface (closest to the plasma membrane) of the outer epidermal wall. The nm-wide cellulose microfibrils orientation and multilayer structure were clearly observed. The microfibril orientation and alignment tend to be more organized in older scales compared with younger scales. The onion epidermis cell wall was also used as a test analog to study cell wall elasticity by the AFM nanoindentation and the SAM V(z) feature. The novelty in this work was to demonstrate the capability of these two techniques to analyze isolated, single layered plant cell walls in their natural state. AFM nanoindentation was also used to probe the effects of Ethylenediaminetetraacetic acid (EDTA), and calcium ion treatment to modify pectin networks in cell walls. The results suggest a significant modulus increase in the calcium ion treatment and a slight decrease in EDTA treatment. To complement the AFM measurements, the HF-SAM was used to obtain the V(z) signatures of the onion epidermis. These measurements were focused on documenting the effect of pectinase enzyme treatment. The results indicate a significant change in the V(z) signature curves with time into the enzyme treatment. Thus AFM and HF-SAM open the door to a systematic nondestructive structure and mechanical property study of complex biological cell walls. A unique feature of this approach is that both microscopes allow the biological samples to be examined in their natural fluid (water) environment.

  13. Alpha-recoil tracks in natural dark mica: Dating geological samples by optical and scanning force microscopy

    E-Print Network [OSTI]

    -differential-interference-contrast microscopy; Scanning force microscopy; Natural radiation damage 1. Introduction Alpha-recoil tracks (ARTsAlpha-recoil tracks in natural dark mica: Dating geological samples by optical and scanning force

  14. Hydrogen adsorption on Ru(001) studied by Scanning Tunneling Microscopy

    E-Print Network [OSTI]

    Tatarkhanov, Mous; Rose, Franck; Fomin, Evgeny; Ogletree, D. Frank; Salmeron, Miquel

    2008-01-01T23:59:59.000Z

    001) and first hydrogen adsorption structure with (?3×?3)R30Hydrogen adsorption on Ru(001) studied by Scanning TunnelingCA 94720 Keywords: STM, Adsorption, Dissociation; Hydrogen,

  15. Acquisition and reconstruction of brain tissue using knife-edge scanning microscopy

    E-Print Network [OSTI]

    Mayerich, David Matthew

    2004-09-30T23:59:59.000Z

    ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE- EDGE SCANNING MICROSCOPY A Thesis by DAVID MATTHEW MAYERICH Submitted to the Office of Graduate Studies of Texas A&M University in partial fulfillment of the requirements... for the degree of MASTER OF SCIENCE December 2003 Major Subject: Computer Science ACQUISITION AND RECONSTRUCTION OF BRAIN TISSUE USING KNIFE- EDGE SCANNING MICROSCOPY A Thesis by DAVID MATTHEW MAYERICH Submitted to Texas...

  16. SCANNING ACOUSTIC MICROSCOPY MODELING FOR MICROMECHANICAL MEASUREMENTS OF COMPLEX SUBSTRATES

    E-Print Network [OSTI]

    Marangos, Orestes

    2010-05-31T23:59:59.000Z

    , Composition and Mechanical Properties ...................................... 80 3.5 Characteristics of Acid-Etched Dentin...................................................................... 82 3.6 Application of SAM to dental materials... structure and composition at different spatial scales which is responsible for how material properties manifest in experimental measurements. In order to observe a material property, we “probe” and measure the reaction. The observable property is thus...

  17. Molecularly Resolved Images of Peptide-Functionalized Gold Surfaces by Scanning Tunneling Microscopy

    E-Print Network [OSTI]

    Webb, Lauren J.

    Molecularly Resolved Images of Peptide-Functionalized Gold Surfaces by Scanning Tunneling propargylglycine unnatural functional groups 20 Å apart and an alkanethiol self-assembled monolayer (SAM) on a gold-terminated surfaces were imaged by scanning tunneling microscopy (STM) using a low tunneling current of 10 p

  18. Oxygen driven reconstruction dynamics of Ni,,977... measured by time-lapse scanning tunneling microscopy

    E-Print Network [OSTI]

    Sibener, Steven

    Oxygen driven reconstruction dynamics of Ni,,977... measured by time-lapse scanning tunneling-lapse scanning tunneling microscopy STM has been used to observe the oxygen induced reconstruction behavior of Ni for the merging of steps in the presence of small amounts of adsorbed oxygen, less than 2% of a monolayer. Point

  19. Video-Rate Scanning Two-Photon Excitation Fluorescence Microscopy and Ratio Imaging with Cameleons

    E-Print Network [OSTI]

    Tsien, Roger Y.

    Video-Rate Scanning Two-Photon Excitation Fluorescence Microscopy and Ratio Imaging with Cameleons ABSTRACT A video-rate (30 frames/s) scanning two-photon excitation microscope has been successfully tested 690 to 1050 nm, prechirper optics for laser pulse-width compression, resonant galvanometer for video

  20. Electrochemical and scanning probe microscopic characterization of spontaneously adsorbed organothiolate monolayers at gold

    SciTech Connect (OSTI)

    Wong, Sze-Shun Season

    1999-12-10T23:59:59.000Z

    This dissertation presented several results which add to the general knowledge base regarding organothiolates monolayer spontaneously adsorbed at gold films. Common to the body of this work is the use of voltammetric reductive resorption and variants of scanning probe microscopy to gain insight into the nature of the monolayer formation process as well as the resulting interface. The most significant result from this work is the success of using friction force microscopy to discriminate the end group orientation of monolayer chemisorbed at smooth gold surfaces with micrometer resolution (Chapter 4). The ability to detect the differences in the orientational disposition is demonstrated by the use PDMS polymer stamp to microcontact print an adlayer of n-alkanethiolate of length n in a predefine pattern onto a gold surface, followed by the solution deposition of a n-alkanethiol of n {+-} 1 to fill in the areas on the gold surface intentionally not coated by the stamping process. These two-component monolayers can be discriminated by using friction force microscopy which detects differences in friction contributed by the differences in the orientation of the terminal groups at surfaces. This success has recently led to the detection of the orientation differences at nanometer scale. Although the substrates examined in this work consisted entirely of smooth gold films, the same test can be performed on other smooth substrates and monolayer materials.

  1. Ultrafast pump-probe force microscopy with nanoscale resolution

    E-Print Network [OSTI]

    2015-01-01T23:59:59.000Z

    Cerullo, “Confocal ultrafast pump-probe spectroscopy: A newand H. J. Maris, “Time-resolved pump-probe experiments withand U. Keller, “Femtosecond pump-porbe near-field optical

  2. Fast, long-scan-range pump-probe measurement based on asynchronous sampling using a dual-

    E-Print Network [OSTI]

    Wu, Shin-Tson

    Fast, long-scan-range pump-probe measurement based on asynchronous sampling using a dual-scan-range pump-probe scheme is experimentally demonstrated using a dual-wavelength passively mode- locked fiber. 134(25), 10569­10583 (2012). 4. A. Schmidt, M. Chiesa, X. Chen, and G. Chen, "An optical pump

  3. Focused ion beam modification of atomic force microscopy tips for near-field scanning optical microscopy

    E-Print Network [OSTI]

    Krogmeier, Jeffrey R.; Dunn, Robert C.

    2001-12-01T23:59:59.000Z

    spatial resolution be- yond the classical diffraction limit.1–3 While the technique can be implemented in several configurations, the most popular utilizes a metal-coated, tapered fiber optic probe to deliver light to nanometric dimensions. Introduced... by Betzig et al. in 1991,2 these metal-coated fiber optic probes have been successfully utilized to study single molecules, thin films, and in limited cases, biological samples.1,3 For the latter, the high spring constant of the fiber optic probes has...

  4. Scanning mid-IR-laser microscopy: an efficient tool for materials studies in silicon-based photonics and photovoltaics

    E-Print Network [OSTI]

    Astafiev, O V; Yuryev, V A; 10.1016/S0022-0248(99)00711-3

    2011-01-01T23:59:59.000Z

    A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in the industries of microelectronics and photovoltaics. The basis for this development was laid with a wide cycle of investigations on low-angle mid-IR-light scattering in semiconductors. The essence of the technical idea was to apply the dark-field method for spatial filtering of the scattered light in the scanning mid-IR-laser microscope together with the local photoexcitation of excess carriers within a small domain in a studied sample, thus forming an artificial source of scattering of the probe IR light for the recombination contrast imaging of defects. The current paper presents three contrasting examples of application of the above technique for defect visualization in silicon-based materials designed for photovoltaics and photonics which demonstrate that this...

  5. Observation of diamond turned OFHC copper using Scanning Tunneling Microscopy

    SciTech Connect (OSTI)

    Grigg, D.A.; Russell, P.E.; Dow, T.A.

    1988-12-01T23:59:59.000Z

    Diamond turned OFHC copper samples have been observed within the past few months using the Scanning Tunneling Microscope. Initial results have shown evidence of artifacts which may be used to better understand the diamond turning process. The STM`s high resolution capability and three dimensional data representation allows observation and study of surface features unobtainable with conventional profilometry systems. Also, the STM offers a better quantitative means by which to analyze surface structures than the SEM. This paper discusses findings on several diamond turned OFHC copper samples having different cutting conditions. Each sample has been cross referenced using STM and SEM.

  6. Kelvin Probe Force Microscopy for in situ Electrical Characterization of Organic Solar Cells

    E-Print Network [OSTI]

    Fisher, Frank

    Kelvin Probe Force Microscopy for in situ Electrical Characterization of Organic Solar Cells., University of Pittsburgh The most efficient organic solar cell today is made from blending conjugated donors and acceptors in bulk heterojunction organic solar cells. Most microscopic characterization

  7. Half-harmonic Kelvin probe force microscopy with transfer function correction

    SciTech Connect (OSTI)

    Guo, Senli [ORNL] [ORNL; Jesse, Stephen [ORNL] [ORNL; Kalinin, Sergei V [ORNL] [ORNL

    2012-01-01T23:59:59.000Z

    An approach for surface potential imaging based on half-harmonic band excitation (BE) in Kelvin probe force microscopy is demonstrated. Using linear and half-harmonic BE enables quantitative correction of the cantilever transfer function. Half-harmonic band excitation Kelvin probe force microscopy (HBE KPFM) thus allows quantitative separation of surface potential and topographic contributions to the signal, obviating the primary sources of topographic cross-talk. HBE KPFM imaging and voltage spectroscopy methods are illustrated for several model systems.

  8. High Pressure Scanning Tunneling Microscopy and High Pressure X-ray Photoemission Spectroscopy Studies of Adsorbate Structure, Composition and Mobility during Catalytic Reactions on A Model Single Crystal

    E-Print Network [OSTI]

    Montano, M.O.

    2006-01-01T23:59:59.000Z

    Guntherodt, H. -J. , Eds. Scanning Tunneling Microscopy III;157. Chapter 7 : High-Pressure Scanning Tunneling Microscopypressure high-temperature scanning tunneling microscope and

  9. Two-Color Ultrafast Photoexcited Scanning Tunneling Microscopy

    SciTech Connect (OSTI)

    Camillone, N.; Dolocan, A.; Acharya, D.P.; Zahl, P.; Sutter, P.

    2011-05-26T23:59:59.000Z

    We report on two-color two-photon photoexcitation of a metal surface driven by ultrafast laser pulses and detected with a scanning tunneling microscope (STM) tip as a proximate anode. Results are presented for two cases: (i) where the tip is retracted from the surface far enough to prohibit tunneling, and (ii) where the tip is within tunneling range of the surface. A delay-modulation technique is implemented to isolate the two-color photoemission from concurrent one-color two-photon photoemission and provide subpicosecond time-resolved detection. When applied with the tip in tunneling range, this approach effectively isolates the two-photon photoexcited current signal from the conventional tunneling current and enables subpicosecond time-resolved detection of the photoexcited surface electrons. The advantage of the two-color approach is highlighted by comparison with the one-color case where optical interference causes thermal modulation of the STM tip length, resulting in tunneling current modulations that are orders of magnitude larger than the current due to photoexcitation of surface electrons. By completely eliminating this interference, and thereby avoiding thermal modulation of the STM tip length, the two-color approach represents an important step toward the ultimate goal of simultaneous subnanometer and subpicosecond measurements of surface electron dynamics by ultrafast-laser-excited STM.

  10. OSTEOBLAST ADHESION OF BREAST CANCER CELLS WITH SCANNING ACOUSTIC MICROSCOPY

    SciTech Connect (OSTI)

    Chiaki Miyasaka; Robyn R. Mercer; Andrea M. Mastro; Ken L. Telschow

    2005-03-01T23:59:59.000Z

    Breast cancer frequently metastasizes to the bone. Upon colonizing bone tissue, the cancer cells stimulate osteoclasts (cells that break bone down), resulting in large lesions in the bone. The breast cancer cells also affect osteoblasts (cells that build new bone). Conditioned medium was collected from a bone-metastatic breast cancer cell line, MDA-MB-231, and cultured with an immature osteoblast cell line, MC3T3-E1. Under these conditions the osteoblasts acquired a changed morphology and appeared to adherer in a different way to the substrate and to each other. To characterize cell adhesion, MC3T3-E1 osteoblasts were cultured with or without MDA-MB-231 conditioned medium for two days, and then assayed with a mechanical scanning acoustic reflection microscope (SAM). The SAM indicated that in normal medium the MC3T3-E1 osteoblasts were firmly attached to their plastic substrate. However, MC3T3-E1 cells cultured with MDA-MB-231 conditioned medium displayed both an abnormal shape and poor adhesion at the substrate interface. The cells were fixed and stained to visualize cytoskeletal components using optical microscopic techniques. We were not able to observe these differences until the cells were quite confluent after 7 days of culture. However, using the SAM, we were able to detect these changes within 2 days of culture with MDA-MB-231 conditioned medium

  11. Wurtzite GaN Surface Structures Studied by Scanning Tunneling Microscopy and Reflection High Energy

    E-Print Network [OSTI]

    Feenstra, Randall

    Wurtzite GaN Surface Structures Studied by Scanning Tunneling Microscopy and Reflection High Energy studies of the surface reconstructions for both the Ga-face and the N-face of wurtzite GaN films grown a surface phenomenon. Although numerous surface studies of wurtzite GaN have been performed, progress

  12. Fabrication and characterization of coaxial scanning near-field optical microscopy cantilever sensors

    E-Print Network [OSTI]

    Aeschlimann, Martin

    -electromechanical (MEMS) fabrication technology in or- der to produce sensors with reproducible optical and mechanicalFabrication and characterization of coaxial scanning near-field optical microscopy cantilever sensors M. Salomo *, D. Bayer, B.R. Schaaf, M. Aeschlimann, E. Oesterschulze * Department of Physics

  13. Scanning electron microscopy study of carbon nanotubes heated at high temperatures in air

    E-Print Network [OSTI]

    . INTRODUCTION Because of their remarkable physical and electronic properties, carbon nanotubes are promising nanotubes in air,3,4 in an oxygen stream,5 or under a flow of carbon dioxide gas.6 Thinning of nanotubesScanning electron microscopy study of carbon nanotubes heated at high temperatures in air Xuekun Lu

  14. Selective Analysis of Molecular States by Functionalized Scanning Tunneling Microscopy Tips Z. T. Deng,1

    E-Print Network [OSTI]

    Gao, Hongjun

    . Deng,1 H. Lin,2 W. Ji,1 L. Gao,1 X. Lin,1 Z. H. Cheng,1 X. B. He,1 J. L. Lu,1 D. X. Shi,1 W. A. Hofer,2Selective Analysis of Molecular States by Functionalized Scanning Tunneling Microscopy Tips Z. T

  15. Cross-sectional Scanning Tunneling Microscopy and Spectroscopy of InGaP/GaAs Heterojunctions

    E-Print Network [OSTI]

    Feenstra, Randall

    1 Cross-sectional Scanning Tunneling Microscopy and Spectroscopy of InGaP/GaAs Heterojunctions Y Abstract Compositionally abrupt InGaP/GaAs heterojunctions grown by gas-source molecular beam epitaxy have the InGaP layer show non-uniform In and Ga distribution. About 1.5 nm of transition region

  16. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun (Berkeley, CA); Ogletree, D. Frank (El Cerrito, CA); Salmeron, Miguel (El Cerrito, CA); Xiao, Xudong (Kowloon, CN)

    1998-01-01T23:59:59.000Z

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  17. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun (Berkeley, CA); Ogletree, D. Frank (El Cerrito, CA); Salmeron, Miguel (El Cerrito, CA); Xiao, Xudong (Kowloon, CN)

    1999-01-01T23:59:59.000Z

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  18. Fast scanning probe for tokamak plasmas J. Boedo, D. Gray, L. Chousal, and R. Conn

    E-Print Network [OSTI]

    Krstic, Miroslav

    Fast scanning probe for tokamak plasmas J. Boedo, D. Gray, L. Chousal, and R. Conn Department of tokamaks. The probe described here has five tips which obtain a full spectrum of plasma parameters such as turbulence and anomalous radial particle transport.3 Understanding the tokamak boundary has pro- found

  19. Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

    E-Print Network [OSTI]

    J. Tisler; T. Oeckinghaus; R. Stöhr; R. Kolesov; F. Reinhard; J. Wrachtrup

    2013-01-02T23:59:59.000Z

    We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the energy transfer distance dependence of 14 the nitrogen-vacancy center to graphene was measured to show the predicted d-4 15 dependence. Our studies pave the way towards a diamond defect center based versatile 16 single emitter scanning microscope.

  20. Imaging of buried phosphorus nanostructures in silicon using scanning tunneling microscopy

    SciTech Connect (OSTI)

    Oberbeck, Lars [Centre for Quantum Computation and Communication Technology, School of Physics, University of New South Wales, Sydney, New South Wales 2052 (Australia); TOTAL Marketing Services, New Energies, La Défense 10, 92069 Paris La Défense Cedex (France); Reusch, Thilo C. G.; Hallam, Toby; Simmons, Michelle Y., E-mail: n.curson@ucl.ac.uk, E-mail: michelle.simmons@unsw.edu.au [Centre for Quantum Computation and Communication Technology, School of Physics, University of New South Wales, Sydney, New South Wales 2052 (Australia); Schofield, Steven R. [Centre for Quantum Computation and Communication Technology, School of Physics, University of New South Wales, Sydney, New South Wales 2052 (Australia); London Centre for Nanotechnology, UCL, London WC1H 0AH (United Kingdom); Department of Physics and Astronomy, UCL, London WC1E 6BT (United Kingdom); Curson, Neil J., E-mail: n.curson@ucl.ac.uk, E-mail: michelle.simmons@unsw.edu.au [Centre for Quantum Computation and Communication Technology, School of Physics, University of New South Wales, Sydney, New South Wales 2052 (Australia); London Centre for Nanotechnology, UCL, London WC1H 0AH (United Kingdom); Department of Electronic and Electrical Engineering, UCL, London WC1E 7JE (United Kingdom)

    2014-06-23T23:59:59.000Z

    We demonstrate the locating and imaging of single phosphorus atoms and phosphorus dopant nanostructures, buried beneath the Si(001) surface using scanning tunneling microscopy. The buried dopant nanostructures have been fabricated in a bottom-up approach using scanning tunneling microscope lithography on Si(001). We find that current imaging tunneling spectroscopy is suited to locate and image buried nanostructures at room temperature and with residual surface roughness present. From these studies, we can place an upper limit on the lateral diffusion during encapsulation with low-temperature Si molecular beam epitaxy.

  1. The material dependence of temperature measurement resolution in thermal scanning electron microscopy

    SciTech Connect (OSTI)

    Wu, Xiaowei; Hull, Robert [Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180 (United States)] [Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180 (United States)

    2013-03-18T23:59:59.000Z

    Thermal scanning electron microscopy is a recently developed temperature mapping technique based on thermal diffuse scattering in electron backscatter diffraction in a scanning electron microscope. It provides nano-scale and non-contact temperature mapping capabilities. Due to the specific temperature sensitive mechanism inherent to this technique, the temperature resolution is highly material dependent. A thorough investigation of what material properties affect the temperature resolution is important for realizing the inherent temperature resolution limit for each material. In this paper, three material dependent parameters-the Debye-Waller B-factor temperature sensitivity, backscatter yield, and lattice constant-are shown to control the temperature resolution.

  2. Atom probe field ion microscopy and related topics: A bibliography 1990

    SciTech Connect (OSTI)

    Russell, K.F.; Miller, M.K.

    1991-12-01T23:59:59.000Z

    This bibliography includes references related to the following topics: atom probe field ion microscopy (APFIM), field ion microscopy (FIM), field emission (FE), ion sources, and field desorption mass microscopy (FDMM). Technique-orientated studies and applications are included. The bibliography covers the period 1990. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references, listed alphabetically by authors, are subdivided into the categories listed in paragraph one above. An Addendum of references missed in previous bibliographies is included.

  3. Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules

    SciTech Connect (OSTI)

    Aburaya, Yoshihiro; Nomura, Hikaru; Kageshima, Masami; Naitoh, Yoshitaka; Li, Yan Jun; Sugawara, Yasuhiro [Department of Applied Physics, Graduate School of Engineering, Osaka University 2-1 Yamada-oka, Suita, Osaka 565-0871 (Japan)

    2011-03-15T23:59:59.000Z

    An attempt to develop an atomic force microscopy (AFM) probe with optically switchable polarization is described. Modification with a single molecular layer of photochromic molecules was attempted onto a Si substrate that is a prototype for a probe surface. Polarization switching caused by alternate irradiation of UV and visible lights were detected using the electrostatic force?>spectroscopy (EFS) technique. Si substrates modified with spiropyran and azobenzene exhibited reversible polarization switching that caused changes in CPD of about 100 and 50 mV, respectively. Modification with spiropyran was also attempted onto a Si probe and resulted in a CPD change of about 100 mV. It was confirmed that modification of an AFM probe or substrate with a single molecular layer of photochromic molecules can generate surface polarization switching of a mechanically detectable level.

  4. Tensile strain measurements of ceramic fibers using scanning laser acoustic microscopy

    SciTech Connect (OSTI)

    Kent, R.M.; Vary, A.

    1992-01-01T23:59:59.000Z

    A noncontacting technique using scanning laser acoustic microscopy for making in situ tensile strain measurements of small diameter fibers was implemented for the tensile strain analysis of individual Nicalon SiC fibers (nominal diameter 15 microns). Stress versus strain curves for the fibers were plotted from the experimental data. The mean elastic modulus of the fibers was determined to be 185.3 GPa. Similar measurements were made for Carborundum SiC fibers (nominal diameter 28 microns) and Saphikon sapphire fibers (nominal diameter 140 microns), yielding and elastic modulus of 401 and 466.8 GPa, respectively.

  5. Tensile strain measurements of ceramic fibers using scanning laser acoustic microscopy

    SciTech Connect (OSTI)

    Kent, R.M.; Vary, A.

    1992-08-01T23:59:59.000Z

    A noncontacting technique using scanning laser acoustic microscopy for making in situ tensile strain measurements of small diameter fibers was implemented for the tensile strain analysis of individual Nicalon SiC fibers (nominal diameter 15 microns). Stress vs strain curves for the fibers were plotted from the experimental data. The mean elastic modulus of the fibers was determined to be 185.3 GPa. Similar measurements were made for Carborundum SiC fibers (nominal diameter 28 microns) and Saphikon sapphire fibers (nominal diameter 140 microns). 8 refs.

  6. Reliable strain measurement in transistor arrays by robust scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Kim, Suhyun; Kim, Joong Jung; Jung, Younheum; Lee, Kyungwoo; Byun, Gwangsun; Hwang, KyoungHwan; Lee, Sunyoung; Lee, Kyupil [Memory Analysis Science and Engineering Group, Samsung Electronics, San 16, Hwasung City, Gyeonggi-Do 445-701 (Korea, Republic of)] [Memory Analysis Science and Engineering Group, Samsung Electronics, San 16, Hwasung City, Gyeonggi-Do 445-701 (Korea, Republic of)

    2013-09-15T23:59:59.000Z

    Accurate measurement of the strain field in the channels of transistor arrays is critical for strain engineering in modern electronic devices. We applied atomic-resolution high-angle annular dark-field scanning transmission electron microscopy to quantitative measurement of the strain field in transistor arrays. The quantitative strain profile over 20 transistors was obtained with high reliability and a precision of 0.1%. The strain field was found to form homogeneously in the channels of the transistor arrays. Furthermore, strain relaxation due to the thin foil effect was quantitatively investigated for thicknesses of 35 to 275 nm.

  7. Low temperature laser scanning microscopy of a superconducting radio-frequency cavity

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ciovati, Gianluigi; Baldwin, Charles; Cheng, Guangfeng; Flood, Roger; Jordan, Kevin; Kneisel, Peter; Morrone, Michael; Nemes, George; Turlington, Larry; Wang, Haipeng; Wilson, Katherine

    2012-03-16T23:59:59.000Z

    An apparatus was developed to obtain, for the first time, 2D maps of the surface resistance of the inner surface of an operating superconducting radio-frequency niobium cavity by a low-temperature laser scanning microscopy technique. This allows identifying non-uniformities of the surface resistance with a spatial resolution of about one order of magnitude better than with earlier methods. A signal-to-noise ratio of about 10 dB was obtained with 240 mW laser power and 1 Hz modulation frequency. The various components of the apparatus, the experimental procedure and results are discussed in details in this contribution.

  8. NOVEL INTEGRATING SOLID STATE DETECTOR WITH SEGMENTATION FOR SCANNING TRANSMISSION SOFT X-RAY MICROSCOPY.

    SciTech Connect (OSTI)

    FESER,M.; JACOBSEN,C.; REHAK,P.; DE GERONIMO,G.; HOLL,P.; STUDER,L.

    2001-07-29T23:59:59.000Z

    An integrating solid state detector with segmentation has been developed that addresses the needs in scanning transmission x-ray microscopy below 1 keV photon energy. The detector is not cooled and can be operated without an entrance window which leads to a total photon detection efficiency close to 100%. The chosen segmentation with 8 independent segments is matched to the geometry of the STXM to maximize image mode flexibility. In the bright field configuration for 1 ms integration time and 520 eV x-rays the rms noise is 8 photons per integration.

  9. Synchronous digitization for high dynamic range lock-in amplification in beam-scanning microscopy

    SciTech Connect (OSTI)

    Muir, Ryan D.; Sullivan, Shane Z.; Oglesbee, Robert A.; Simpson, Garth J., E-mail: gsimpson@purdue.edu [Department of Chemistry, Purdue University, 560 Oval Drive, West Lafayette, Indiana 47907 (United States)

    2014-03-15T23:59:59.000Z

    Digital lock-in amplification (LIA) with synchronous digitization (SD) is shown to provide significant signal to noise (S/N) and linear dynamic range advantages in beam-scanning microscopy measurements using pulsed laser sources. Direct comparisons between SD-LIA and conventional LIA in homodyne second harmonic generation measurements resulted in S/N enhancements consistent with theoretical models. SD-LIA provided notably larger S/N enhancements in the limit of low light intensities, through the smooth transition between photon counting and signal averaging developed in previous work. Rapid beam scanning instrumentation with up to video rate acquisition speeds minimized photo-induced sample damage. The corresponding increased allowance for higher laser power without sample damage is advantageous for increasing the observed signal content.

  10. Note: Switching crosstalk on and off in Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Polak, Leo, E-mail: l.polak@vu.nl; Wijngaarden, Rinke J. [Division of Physics and Astronomy, VU University Amsterdam, Amsterdam (Netherlands)] [Division of Physics and Astronomy, VU University Amsterdam, Amsterdam (Netherlands); Man, Sven de [Huygens-Kamerlingh Onnes Laboratorium, Leiden University, Leiden (Netherlands)] [Huygens-Kamerlingh Onnes Laboratorium, Leiden University, Leiden (Netherlands)

    2014-04-15T23:59:59.000Z

    In Kelvin Probe Force Microscopy (KPFM) electronic crosstalk can occur between the excitation signal and probe deflection signal. Here, we demonstrate how a small modification to our commercial instrument enables us to literally switch the crosstalk on and off. We study in detail the effect of crosstalk on open-loop KPFM and compare with closed-loop KPFM. We measure the pure crosstalk signal and verify that we can correct for it in the data-processing required for open-loop KPFM. We also demonstrate that open-loop KPFM results are independent of the frequency and amplitude of the excitation signal, provided that the influence of crosstalk has been eliminated.

  11. Rapid imaging of mycoplasma in solution using Atmospheric Scanning Electron Microscopy (ASEM)

    SciTech Connect (OSTI)

    Sato, Chikara, E-mail: ti-sato@aist.go.jp [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8566 (Japan)] [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8566 (Japan); Manaka, Sachie [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8566 (Japan)] [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8566 (Japan); Nakane, Daisuke [Department of Biology, Graduate School of Science, Osaka City University, Sumiyoshi-ku, Osaka 558-8585 (Japan)] [Department of Biology, Graduate School of Science, Osaka City University, Sumiyoshi-ku, Osaka 558-8585 (Japan); Nishiyama, Hidetoshi; Suga, Mitsuo [Advanced Technology Division, JEOL Ltd., Akishima, Tokyo 196-8558 (Japan)] [Advanced Technology Division, JEOL Ltd., Akishima, Tokyo 196-8558 (Japan); Nishizaka, Takayuki [Department of Physics, Faculty of Science, Gakushuin University, 1-5-1 Mejiro, Toshima-ku, Tokyo 171-8588 (Japan)] [Department of Physics, Faculty of Science, Gakushuin University, 1-5-1 Mejiro, Toshima-ku, Tokyo 171-8588 (Japan); Miyata, Makoto [Department of Biology, Graduate School of Science, Osaka City University, Sumiyoshi-ku, Osaka 558-8585 (Japan)] [Department of Biology, Graduate School of Science, Osaka City University, Sumiyoshi-ku, Osaka 558-8585 (Japan); Maruyama, Yuusuke [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8566 (Japan)] [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8566 (Japan)

    2012-01-27T23:59:59.000Z

    Highlights: Black-Right-Pointing-Pointer Mycoplasma mobile was observed in buffer with the Atmospheric Scanning Electron Microscope. Black-Right-Pointing-Pointer Characteristic protein localizations were visualized using immuno-labeling. Black-Right-Pointing-Pointer M. mobile attached to sialic acid on the SiN film surface within minutes. Black-Right-Pointing-Pointer Cells were observed at low concentrations. Black-Right-Pointing-Pointer ASEM should promote study and early-stage diagnosis of mycoplasma. -- Abstract: Mycoplasma is a genus of bacterial pathogen that causes disease in vertebrates. In humans, the species Mycoplasma pneumoniae causes 15% or more of community-acquired pneumonia. Because this bacterium is tiny, corresponding in size to a large virus, diagnosis using optical microscopy is not easy. In current methods, chest X-rays are usually the first action, followed by serology, PCR amplification, and/or culture, but all of these are particularly difficult at an early stage of the disease. Using Mycoplasma mobile as a model species, we directly observed mycoplasma in buffer with the newly developed Atmospheric Scanning Electron Microscope (ASEM). This microscope features an open sample dish with a pressure-resistant thin film window in its base, through which the SEM beam scans samples in solution, from below. Because of its 2-3 {mu}m-deep scanning capability, it can observe the whole internal structure of mycoplasma cells stained with metal solutions. Characteristic protein localizations were visualized using immuno-labeling. Cells were observed at low concentrations, because suspended cells concentrate in the observable zone by attaching to sialic acid on the silicon nitride (SiN) film surface within minutes. These results suggest the applicability of the ASEM for the study of mycoplasmas as well as for early-stage mycoplasma infection diagnosis.

  12. The application of reflected light microscopy, scanning electron microscopy-energy dispersive spectroscopy, Auger electron spectroscopy and electron microprobe analysis to the study of dusts

    SciTech Connect (OSTI)

    Hagni, A.M.; Hagni, R.D. (Univ. of Missouri, Rolla, MO (United States). Dept. of Geology and Geophysics)

    1993-03-01T23:59:59.000Z

    Over 500,000 tons of electric arc furnace (EAF) dust is generated each year in the US. The mineralogy and characterization of this dust is being studied to determine the phases and relationships of the valuable zinc, the hazardous lead, cadmium, and chromium, and the deleterious chlorine and fluorine. EAF dust averages 15--20% zinc and is therefore a potential source for 100,000 tons of zinc per year. The major mineralogical phases of EAF dust are franklinite (ZnFe[sub 2]O[sub 4]), magnetite (FeFe[sub 2]O[sub 4]), jacobsite (MnFe[sub 2]O[sub 4]), solid solutions between franklinite-magnetite-jacobsite, and zincite (ZnO). Franklinite, magnetite, and jacobsite solid solutions commonly are cruciform or dendritic crystals in a Ca-Fe-Si matrix and contain up to 5% chromium. Magnetite also occurs as spheres partially oxidized to hematite (Fe[sub 2]O[sub 3]) along its octahedral planes. The dust particles are predominantly in the form of spheres and broken spheres, ranging in size from 200 [mu]m to less than 1 [mu]m. Although many spheres are in the size ranges of 40--50 [mu]m and 10--20 [mu]m, most are less than 1 [mu]m in diameter. Automated scanning electron microscopy-energy dispersive spectroscopy (SEM-EDS) probed 118 particles in search of chlorine phases. Chlorine-bearing lime (CaO) was identified by that SEM study. In addition, chlorine is present as hydrophylite (CaCl[sub 2]) and sylvite (KCl). Auger electron spectroscopy (AES) was used to sputter the outer 180[angstrom] layer of the dust particles to search for the possible presence of cotunnite (PbCl[sub 2]) coatings, but none were detected. Minor phases detected include chalcopyrite (CuFeS[sub 2]), sphalerite (ZnS), pyrite (FeS[sub 2]), and coke.

  13. Dynamic Imaging of Au-nanoparticles via Scanning Electron Microscopy in a Graphene Wet Cell

    E-Print Network [OSTI]

    Wayne Yang; Yuning Zhang; Michael Hilke; Walter Reisner

    2015-06-10T23:59:59.000Z

    High resolution nanoscale imaging in liquid environments is crucial for studying molecular interactions in biological and chemical systems. In particular, electron microscopy is the gold-standard tool for nanoscale imaging, but its high-vacuum requirements make application to in-liquid samples extremely challenging. Here we present a new graphene based wet cell device where high resolution SEM (scanning electron microscope) and Energy Dispersive X-rays (EDX) analysis can be performed directly inside a liquid environment. Graphene is an ideal membrane material as its high transparancy, conductivity and mechanical strength can support the high vacuum and grounding requirements of a SEM while enabling maximal resolution and signal. In particular, we obtain high resolution (graphene wet cell and EDX analysis of nanoparticle composition in the liquid enviornment. Our obtained resolution surpasses current conventional silicon nitride devices imaged in both SEM and TEM under much higher electron doses.

  14. Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface

    SciTech Connect (OSTI)

    Collins, Liam; Rodriguez, Brian J., E-mail: brian.rodriguez@ucd.ie [School of Physics, University College Dublin, Belfield, Dublin 4 (Ireland); Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4 (Ireland); Kilpatrick, Jason I.; Weber, Stefan A. L. [Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4 (Ireland); Vlassiouk, Ivan V. [Energy and Transportation Science Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Tselev, Alexander; Jesse, Stephen; Kalinin, Sergei V. [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

    2014-03-31T23:59:59.000Z

    Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions. However, for many energy storage and conversion systems, including graphene-based electrochemical capacitors, understanding electrochemical phenomena at the solid–liquid interface is paramount. Despite the vast potential to provide fundamental insight for energy storage materials at the nanoscale, KPFM has found limited applicability in liquid environments to date. Here, using dual harmonic (DH)-KPFM, we demonstrate CPD imaging of graphene in liquid. We find good agreement with measurements performed in air, highlighting the potential of DH-KPFM to probe electrochemistry at the graphene–liquid interface.

  15. Combining In-Situ Buffer-Layer-Assisted-Growth with Scanning...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Capability Development Proposals Combining In Situ Buffer-Layer-Assisted-Growth with Scanning Probe Microscopy for Formation and Study of Supported Model Catalysts Project start...

  16. GaN(0001) Surface Structures Studied Using Scanning Tunneling Microscopy and First-Principles Total Energy Calculations

    E-Print Network [OSTI]

    occurring on the (0001) surface of wurtzite GaN are studied using scanning tunneling microscopy, electron and electronic properties of wurtzite GaN surfaces. Several prior studies have reported that these surfaces do reconstructions were identified, corresponding to the two inequivalent polar fac- es of wurtzite GaN, the (0001

  17. Wurtzite GaN surface structures studied by scanning tunneling microscopy and reflection high energy electron diffraction

    E-Print Network [OSTI]

    Wurtzite GaN surface structures studied by scanning tunneling microscopy and reflection high energy-face of wurtzite GaN films grown using molecular beam epitaxy. N-face reconstructions are primarily adatom numerous surface studies of wurtzite GaN have been performed, progress in determining the true surface

  18. Graphene on Ru(0001) Moire Corrugation Studied by Scanning Tunneling Microscopy on Au/Graphene/Ru(0001) Heterostructures

    E-Print Network [OSTI]

    Ciobanu, Cristian

    Graphene on Ru(0001) Moire Corrugation Studied by Scanning Tunneling Microscopy on Au/Graphene on graphene/Ru(0001) were used to study the corrugation of the moire structure of graphene/Ru(0001 for the graphene/Ru(0001) moire is of structural nature rather than electronic. STM showed a large value

  19. This image presents a scanning electron microscopy image of solid state dye-sensitized solar cell with a

    E-Print Network [OSTI]

    McGehee, Michael

    This image presents a scanning electron microscopy image of solid state dye-sensitized solar cell­57 Dye-sensitized solar cells (DSCs) have received wide-spread research attention due to their high power incorporated into solid-state dye-sensitized solar cells (ss-DSCs) by nanoimprint lithography. The reflectors

  20. Oxidized GaN(0001) Surfaces studied by Scanning Tunneling Microscopy and Spectroscopy and by First-Principles Theory

    E-Print Network [OSTI]

    Feenstra, Randall

    1 Oxidized GaN(0001) Surfaces studied by Scanning Tunneling Microscopy and Spectroscopy Abstract Oxidized Ga-polar GaN surfaces have been studied both experimentally and theoretically. For in tunneling spectroscopy revealed a surface band gap with size close to that of GaN, indicating that any

  1. Scanning Tunneling Microscopy Study of Cr-doped GaN Surface Grown by RF Plasma Molecular Beam Epitaxy

    E-Print Network [OSTI]

    on sapphire substrate [2]. Park et al. performed the growth of Cr doped GaN single crystal by sodium fluxScanning Tunneling Microscopy Study of Cr-doped GaN Surface Grown by RF Plasma Molecular Beam Orleans, New Orleans, LA 70148, USA Abstract: Cr doped GaN was grown by rf N-plasma molecular beam epitaxy

  2. Scanning Tunneling Microscopy Study of Cr-doped GaN Surface Grown by RF Plasma Molecular Beam Epitaxy

    E-Print Network [OSTI]

    doped MOCVD grown GaN on sapphire substrate [2]. Park et al. performed the growth of Cr doped GaN singleScanning Tunneling Microscopy Study of Cr-doped GaN Surface Grown by RF Plasma Molecular Beam Orleans, New Orleans, LA 70148, USA Abstract: Cr doped GaN was grown by rf N-plasma molecular beam epitaxy

  3. Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research

    E-Print Network [OSTI]

    Moffet, Ryan C.

    2011-01-01T23:59:59.000Z

    2-ID-B intermediate-energy scanning X-ray microscope at theW. D. , Morrison, G. R. et al. Scanning transmission X-rayX-ray spectromicroscopy with the scanning transmission X-ray

  4. Scanning tunneling microscopy/spectroscopy of picene thin films formed on Ag(111)

    SciTech Connect (OSTI)

    Yoshida, Yasuo, E-mail: yyoshida@issp.u-tokyo.ac.jp; Yokosuka, Takuya; Hasegawa, Yukio, E-mail: hasegawa@issp.u-tokyo.ac.jp [The Institute of Solid State Physics, The University of Tokyo, Kashiwa 277-8581 (Japan); Yang, Hung-Hsiang [Department of Physics, National Taiwan University, Taipei 106, Taiwan (China); Huang, Hsu-Sheng; Guan, Shu-You; Su, Wei-Bin; Chang, Chia-Seng [Institute of Physics, Academia Sinica, Nankang, Taipei 11529, Taiwan (China); Yanagisawa, Susumu [Department of Physics and Earth Science Department, University of the Ryukyus, 1 Nishihara, Okinawa 903-0213 (Japan); Lin, Minn-Tsong [Department of Physics, National Taiwan University, Taipei 106, Taiwan (China); Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan (China); Hoffmann, Germar [The Institute of Solid State Physics, The University of Tokyo, Kashiwa 277-8581 (Japan); Department of Physics, National Tsing Hua University, Hsinchu 30013, Taiwan (China)

    2014-09-21T23:59:59.000Z

    Using ultrahigh-vacuum low-temperature scanning tunneling microscopy and spectroscopy combined with first principles density functional theory calculations, we have investigated structural and electronic properties of pristine and potassium (K)-deposited picene thin films formed in situ on a Ag(111) substrate. At low coverages, the molecules are uniformly distributed with the long axis aligned along the [112{sup ¯}] direction of the substrate. At higher coverages, ordered structures composed of monolayer molecules are observed, one of which is a monolayer with tilted and flat-lying molecules resembling a (11{sup ¯}0) plane of the bulk crystalline picene. Between the molecules and the substrate, the van der Waals interaction is dominant with negligible hybridization between their electronic states; a conclusion that contrasts with the chemisorption exhibited by pentacene molecules on the same substrate. We also observed a monolayer picene thin film in which all molecules were standing to form an intermolecular ? stacking. Two-dimensional delocalized electronic states are found on the K-deposited ? stacking structure.

  5. Ultrasonic probe deployment device for increased wave transmission and rapid area scan inspections

    DOE Patents [OSTI]

    DiMambro, Joseph; Roach, Dennis P; Rackow, Kirk A; Nelson, Ciji L; Dasch, Cameron J; Moore, David G

    2013-02-12T23:59:59.000Z

    An ultrasonic probe deployment device in which an ultrasound-transmitting liquid forms the portion of the ultrasonic wave path in contact with the surface being inspected (i.e., the inspection surface). A seal constrains flow of the liquid, for example preventing the liquid from surging out and flooding the inspection surface. The seal is not rigid and conforms to variations in the shape and unevenness of the inspection surface, thus forming a seal (although possibly a leaky seal) around the liquid. The probe preferably is held in place to produce optimum ultrasonic focus on the area of interest. Use of encoders can facilitate the production of C-scan area maps of the material being inspected.

  6. Ultrasonic probe deployment device for increased wave transmission and rapid area scan inspections

    SciTech Connect (OSTI)

    DiMambro, Joseph (Placitas, NM); Roach, Dennis P. (Albuquerque, NM); Rackow, Kirk A. (Albuquerque, NM); Nelson, Ciji L. (Albuquerque, NM); Dasch, Cameron J. (Boomfield Hills, MI); Moore, David G. (Albuquerque, NM)

    2012-01-03T23:59:59.000Z

    An ultrasonic probe deployment device in which an ultrasound-transmitting liquid forms the portion of the ultrasonic wave path in contact with the surface being inspected (i.e., the inspection surface). A seal constrains flow of the liquid, for example preventing the liquid from surging out and flooding the inspection surface. The seal is not rigid and conforms to variations in the shape and unevenness of the inspection surface, thus forming a seal (although possibly a leaky seal) around the liquid. The probe preferably is held in place to produce optimum ultrasonic focus on the area of interest. Use of encoders can facilitate the production of C-scan area maps of the material being inspected.

  7. Nanocrystalline Ni-3.6 at.% P and its transformation sequence studied by atom-probe field-ion microscopy

    SciTech Connect (OSTI)

    Hentschel, T.; Isheim, D.; Kirchheim, R.; Mueller, F.; Kreye, H.

    2000-02-25T23:59:59.000Z

    The transformation sequence of electroless plated nanocrystalline Ni-3.6 at.% P layers upon different heat treatments is studied by means of differential scanning calorimetry (DSC), X-ray diffraction (XRD) and atom-probe field-ion microscopy (APFIM). APFIM reveals P segregation at the grain boundaries in the as-plated nanocrystalline alloy. DSC shows two heat releases upon isochronic heat treatment. During the first heat release, starting at about 136 C for a heating rate of 20 C/min, structural relaxation occurs first, followed by slight crystal growth and segregation enhancement, as shown by XRD and APFIM. Nucleation of the equilibrium phase Ni{sub 3}P starts in the transition to the second heat release. This second heat release, with a sharp onset at 417 C for heating at a rate of 20 C/min, is related to the major part of Ni{sub 3}P-phase formation and substantial grain growth. The transformation sequence is compared with the one observed on amorphous Ni-P alloys and discussed in terms of a thermodynamic model.

  8. Out of equilibrium GigaPa Young modulus of water nanobridge probed by Force Feedback Microscopy

    E-Print Network [OSTI]

    Simon Carpentier; Mario S. Rodrigues; Luca Costa; Miguel V. Vitorino; Elisabeth Charlaix; Joel Chevrier

    2015-03-18T23:59:59.000Z

    Because of capillary condensation, water droplets appear in nano/micropores. The large associated surface interactions can deeply influence macroscopic properties as in granular media. We report that dynamical properties of such nanobridge dramatically change when probed at different time scales. Using a novel AFM mode, the Force Feedback Microscopy, the gap between the nanotip and the surface is continuously varied, and we observe this change in the simultaneous measurements, at different frequencies, of the stiffness G'(N/m), the dissipative coefficient G"(kg/sec) together with the static force. As the measuring time approaches the microsecond, the liquid droplet exhibits a large positive stiffness (it is small and negative in the long time limit). Although clearly controlled by surface effects, it compares to the stiffness of a solid nanobridge with a 1 GigaPa Young modulus. We argue that as evaporation and condensation gradually lose efficiency, the contact line progressively becomes immobile, which explains this behavior.

  9. Out of equilibrium GigaPa Young modulus of water nanobridge probed by Force Feedback Microscopy

    E-Print Network [OSTI]

    Carpentier, Simon; Costa, Luca; Vitorino, Miguel V; Charlaix, Elisabeth; Chevrier, Joel

    2015-01-01T23:59:59.000Z

    Because of capillary condensation, water droplets appear in nano/micropores. The large associated surface interactions can deeply influence macroscopic properties as in granular media. We report that dynamical properties of such nanobridge dramatically change when probed at different time scales. Using a novel AFM mode, the Force Feedback Microscopy, the gap between the nanotip and the surface is continuously varied, and we observe this change in the simultaneous measurements, at different frequencies, of the stiffness G'(N/m), the dissipative coefficient G"(kg/sec) together with the static force. As the measuring time approaches the microsecond, the liquid droplet exhibits a large positive stiffness (it is small and negative in the long time limit). Although clearly controlled by surface effects, it compares to the stiffness of a solid nanobridge with a 1 GigaPa Young modulus. We argue that as evaporation and condensation gradually lose efficiency, the contact line progressively becomes immobile, which expla...

  10. SCANNING ELECTRON MICROSCOPY AND X-RAY DIFFRACTION ANALYSIS OF TANK 18 SAMPLES

    SciTech Connect (OSTI)

    Hay, M.; O'Rourke, P.; Ajo, H.

    2012-03-08T23:59:59.000Z

    The F-Area Tank Farm (FTF) Performance Assessment (PA) utilizes waste speciation in the waste release model used in the FTF fate and transport modeling. The waste release modeling associated with the residual plutonium in Tank 18 has been identified as a primary contributor to the Tank 18 dose uncertainty. In order to reduce the uncertainty related to plutonium in Tank 18, a better understanding of the plutonium speciation in the Tank 18 waste (including the oxidation state and stoichiometry) is desired. Savannah River National Laboratory (SRNL) utilized Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to analyze Tank 18 samples to provide information on the speciation of plutonium in the waste material. XRD analysis of the Tank 18 samples did not identify any plutonium mineral phases in the samples. These indicates the crystalline mineral phases of plutonium are below the detection limits of the XRD method or that the plutonium phase(s) lack long range order and are present as amorphous or microcrystalline solids. SEM analysis of the Tank 18 samples did locate particles containing plutonium. The plutonium was found as small particles, usually <1 {micro}m but ranging up to several micrometers in diameter, associated with particles of an iron matrix and at low concentration in other elemental matrices. This suggests the plutonium has an affinity for the iron matrix. Qualitatively, the particles of plutonium found in the SEM analysis do not appear to account for all of the plutonium in the sample based on concentrations determined from the chemical analysis of the Tank 18 samples. This suggests that plutonium is also distributed throughout the solids in low concentrations.

  11. Nanomechanical and topographical imaging of living cells by Atomic Force Microscopy with colloidal probes

    E-Print Network [OSTI]

    Luca Puricelli; Massimiliano Galluzzi; Carsten Schulte; Alessandro Podestà; Paolo Milani

    2015-02-05T23:59:59.000Z

    Atomic Force Microscopy (AFM) has a great potential as a tool to characterize mechanical and morphological properties of living cells; these properties have been shown to correlate with cells' fate and patho-physiological state in view of the development of novel early-diagnostic strategies. Although several reports have described experimental and technical approaches for the characterization of cell elasticity by means of AFM, a robust and commonly accepted methodology is still lacking. Here we show that micrometric spherical probes (also known as colloidal probes) are well suited for performing a combined topographic and mechanical analysis of living cells, with spatial resolution suitable for a complete and accurate mapping of cell morphological and elastic properties, and superior reliability and accuracy in the mechanical measurements with respect to conventional and widely used sharp AFM tips. We address a number of issues concerning the nanomechanical analysis, including the applicability of contact mechanical models and the impact of a constrained contact geometry on the measured elastic modulus (the finite-thickness effect). We have tested our protocol by imaging living PC12 and MDA-MB-231 cells, in order to demonstrate the importance of the correction of the finite-thickness effect and the change in cell elasticity induced by the action of a cytoskeleton-targeting drug.

  12. A calibration method for lateral forces for use with colloidal probe force microscopy cantilevers

    SciTech Connect (OSTI)

    Quintanilla, M. A. S.; Goddard, D. T. [Nexia Solutions Ltd., Springfields, Salwick, Preston, Lancashire PR4 0XJ (United Kingdom)

    2008-02-15T23:59:59.000Z

    A calibration method is described for colloidal probe cantilevers that enables friction force measurements obtained using lateral force microscopy (LFM) to be quantified. The method is an adaptation of the lever method of Feiler et al. [A. Feiler, P. Attard, and I. Larson, Rev. Sci. Instum. 71, 2746 (2000)] and uses the advantageous positioning of probe particles that are usually offset from the central axis of the cantilever. The main sources of error in the calibration method are assessed, in particular, the potential misalignment of the long axis of the cantilever that ideally should be perpendicular to the photodiode detector. When this is not taken into account, the misalignment is shown to have a significant effect on the cantilever torsional stiffness but not on the lateral photodiode sensitivity. Also, because the friction signal is affected by the topography of the substrate, the method presented is valid only against flat substrates. Two types of particles, 20 {mu}m glass beads and UO{sub 3} agglomerates attached to silicon tapping mode cantilevers were used to test the method against substrates including glass, cleaved mica, and UO{sub 2} single crystals. Comparisons with the lateral compliance method of Cain et al. [R. G. Cain, S. Biggs, and N. W. Page, J. Colloid Interface Sci. 227, 55 (2000)] are also made.

  13. Controlled Low-Temperature Molecular Manipulation of Sexiphenyl Molecules on Ag(111) Using Scanning Tunneling Microscopy

    E-Print Network [OSTI]

    Hla, Saw-Wai

    Controlled Low-Temperature Molecular Manipulation of Sexiphenyl Molecules on Ag(111) Using Scanning; published 11 November 2004) A novel scanning tunneling microscope manipulation scheme for a controlled displaced during imag- ing and often dragged with the STM tip [17]. Atomically controlled manipulation

  14. FLUID DISTRIBUTION IN PROGRESSIVE PULMONARY EDEMA: A LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY STUDY

    E-Print Network [OSTI]

    Hook, Greogry R.

    2013-01-01T23:59:59.000Z

    extchanging function of the lung. Circulation 46: 390-408,electron microscopy of the lungs. Annals. Med. Sect. Pol.Bioengineering Aspects of the Lung, edited by J. B. West,

  15. Investigation of Self-Heating Phenomenon in Small Geometry Vias Using Scanning Joule Expansion Microscopy

    E-Print Network [OSTI]

    Investigation of Self-Heating Phenomenon in Small Geometry Vias Using Scanning Joule Expansion metallization levels) and increases in the current density and associated thermal effects, namely self-heating

  16. Instrument Series: Microscopy Ultra-High Vacuum, Low-

    E-Print Network [OSTI]

    Instrument Series: Microscopy Ultra-High Vacuum, Low- Temperature Scanning Probe Microscope EMSL's ultra-high vacuum, low-temperature scanning probe microscope instrument, or UHV LT SPM range of surface analytical techniques at low temperature ­ enables ultra-violet/X-ray photoelectron

  17. Interface circuits for quartz crystal sensors in scanning probe microscopy applications

    E-Print Network [OSTI]

    La Rosa, Andres H.

    interface based on an amplitude controlled oscillator and a phase-locked loop frequency demodulator, are of great interest. A self-excitation scheme with QCR is particularly promising and allows the development excitation modes in QCR based tech- niques: first, the mechanical excitation QCR is typically at- tached

  18. Vertical inertial sliding drive for coarse and fine approaches in scanning probe microscopy

    E-Print Network [OSTI]

    Gimzewski, James

    vibrational noise. The extension of the technique to a vertical orientation required by many SPM applications stepper motors4 to more elegant approaches such as the "louse,"5 "Besocke," beetle,6 "Inchworm® ,"7

  19. Electron and Scanning Probe Microscopies | U.S. DOE Office of Science (SC)

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOEThe Bonneville Power AdministrationField Campaign:INEAWater UseC Supports - Energy3 PierreElectron

  20. Understanding S-shaped current-voltage characteristics of organic solar cells: Direct measurement of potential distributions by scanning Kelvin probe

    SciTech Connect (OSTI)

    Saive, Rebecca, E-mail: rebecca.saive@innovationlab.de; Kowalsky, Wolfgang [InnovationLab GmbH, 69115 Heidelberg (Germany) [InnovationLab GmbH, 69115 Heidelberg (Germany); Institut für Hochfrequenztechnik, TU Braunschweig, 38106 Braunschweig (Germany); Kirchhoff-Institute for Physics, Heidelberg University, 69120 Heidelberg (Germany); Mueller, Christian [InnovationLab GmbH, 69115 Heidelberg (Germany) [InnovationLab GmbH, 69115 Heidelberg (Germany); Kirchhoff-Institute for Physics, Heidelberg University, 69120 Heidelberg (Germany); Schinke, Janusz; Lovrincic, Robert [InnovationLab GmbH, 69115 Heidelberg (Germany) [InnovationLab GmbH, 69115 Heidelberg (Germany); Institut für Hochfrequenztechnik, TU Braunschweig, 38106 Braunschweig (Germany)

    2013-12-09T23:59:59.000Z

    We present a comparison of the potential distribution along the cross section of bilayer poly(3-hexylthiophene)/1-(3-methoxycarbonyl)propyl-1-phenyl[6,6]C61 (P3HT/PCBM) solar cells, which show normal and anomalous, S-shaped current-voltage (IV) characteristics. We expose the cross sections of the devices with a focussed ion beam and measure them with scanning Kelvin probe microscopy. We find that in the case of S-shaped IV-characteristics, there is a huge potential drop at the PCBM/Al top contact, which does not occur in solar cells with normal IV-characteristics. This behavior confirms the assumption that S-shaped curves are caused by hindered charge transport at interfaces.

  1. High-resolution scanning tunneling microscopy imaging of mesoscopic graphene sheets

    E-Print Network [OSTI]

    by direct exfoli- ation of crystalline graphite. The single-layer films were identified by using Raman layers. In the first method, sample layers are mechanically exfoliated from bulk graphite crystals-layer graphene films prepared by mechanical exfoliation and probed on an insulating substrate

  2. Atomic and electronic structure of monolayer graphene on 6H-SiC(0001)(3 3) : a scanning tunneling microscopy study.

    E-Print Network [OSTI]

    Paris-Sud XI, Université de

    Atomic and electronic structure of monolayer graphene on 6H-SiC(0001)(3 × 3) : a scanning tunneling of the atomic and electronic structure of graphene monolayer islands on the 6H-SiC(0001)(3×3) (SiC(3×3)) surface reconstruction using scanning tunneling microscopy (STM) and spectroscopy (STS). The orientation of the graphene

  3. Simultaneous topographic and elemental chemical and magnetic contrast in scanning tunneling microscopy

    DOE Patents [OSTI]

    Rose, Volker; Preissner, Curt A; Hla, Saw-Wai; Wang, Kangkang; Rosenmann, Daniel

    2014-09-30T23:59:59.000Z

    A method and system for performing simultaneous topographic and elemental chemical and magnetic contrast analysis in a scanning, tunneling microscope. The method and system also includes nanofabricated coaxial multilayer tips with a nanoscale conducting apex and a programmable in-situ nanomanipulator to fabricate these tips and also to rotate tips controllably.

  4. Lateral imaging of the superconducting vortex lattice using Doppler-modulated scanning tunneling microscopy

    E-Print Network [OSTI]

    Wei, John Y.T.

    Lateral imaging of the superconducting vortex lattice using Doppler-modulated scanning tunneling on the quasiparticle tunneling spectrum, we have laterally imaged the vortex lattice in superconducting 2H-NbSe2 that circulates along the sample edge. Above the lower critical field, field can penetrate into the superconductor

  5. Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy

    DOE Patents [OSTI]

    Kazmerski, Lawrence L. (Lakewood, CO)

    1990-01-01T23:59:59.000Z

    A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

  6. Understanding Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic Resolution Electron Microscopy and Field Evaporation Simulation

    SciTech Connect (OSTI)

    Devaraj, Arun; Colby, Robert J.; Vurpillot, F.; Thevuthasan, Suntharampillai

    2014-03-26T23:59:59.000Z

    Metal-dielectric composite materials, specifically metal nanoparticles supported on or embedded in metal oxides, are widely used in catalysis. The accurate optimization of such nanostructures warrants the need for detailed three-dimensional characterization. Atom probe tomography is uniquely capable of generating sub-nanometer structural and compositional data with part-per-million mass sensitivity, but there are reconstruction artifacts for composites containing materials with strongly differing fields of evaporation, as for oxide-supported metal nanoparticles. By correlating atom probe tomography with scanning transmission electron microscopy for Au nanoparticles embedded in an MgO support, deviations from an ideal topography during evaporation are demonstrated directly, and correlated with compositional errors in the reconstructed data. Finite element simulations of the field evaporation process confirm that protruding Au nanoparticles will evolve on the tip surface, and that evaporation field variations lead to an inaccurate assessment of the local composition, effectively lowering the spatial resolution of the final reconstructed dataset. Cross-correlating the experimental data with simulations results in a more detailed understanding of local evaporation aberrations during APT analysis of metal-oxide composites, paving the way towards a more accurate three-dimensional characterization of this technologically important class of materials.

  7. A diamond-based scanning probe spin sensor operating at low temperature in ultra-high vacuum

    SciTech Connect (OSTI)

    Schaefer-Nolte, E.; Wrachtrup, J. [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany) [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany); 3rd Institute of Physics and Research Center SCoPE, University Stuttgart, 70569 Stuttgart (Germany); Reinhard, F. [3rd Institute of Physics and Research Center SCoPE, University Stuttgart, 70569 Stuttgart (Germany)] [3rd Institute of Physics and Research Center SCoPE, University Stuttgart, 70569 Stuttgart (Germany); Ternes, M., E-mail: m.ternes@fkf.mpg.de [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany); Kern, K. [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany) [Max-Planck Institute for Solid State Research, 70569 Stuttgart (Germany); Institut de Physique de la Matière Condenseé, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne (Switzerland)

    2014-01-15T23:59:59.000Z

    We present the design and performance of an ultra-high vacuum (UHV) low temperature scanning probe microscope employing the nitrogen-vacancy color center in diamond as an ultrasensitive magnetic field sensor. Using this center as an atomic-size scanning probe has enabled imaging of nanoscale magnetic fields and single spins under ambient conditions. In this article we describe an experimental setup to operate this sensor in a cryogenic UHV environment. This will extend the applicability to a variety of molecular systems due to the enhanced target spin lifetimes at low temperature and the controlled sample preparation under UHV conditions. The instrument combines a tuning-fork based atomic force microscope (AFM) with a high numeric aperture confocal microscope and the facilities for application of radio-frequency (RF) fields for spin manipulation. We verify a sample temperature of <50 K even for strong laser and RF excitation and demonstrate magnetic resonance imaging with a magnetic AFM tip.

  8. Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ioni Beam-scanning Electron Microscopy

    SciTech Connect (OSTI)

    G Nelson; W Harris; J Lombardo; J Izzo Jr.; W Chiu; P Tanasini; M Cantoni; J Van herle; C Comninellis; et al.

    2011-12-31T23:59:59.000Z

    X-ray nanotomography and focused ion beam scanning electron microscopy (FIB-SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIB-SEM enable elemental mapping within the microstructure. Using these methods, non-destructive 3D x-ray imaging and FIB-SEM serial sectioning have been applied to compare three-dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

  9. Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ion Beam - Scanning Electron Microscopy

    SciTech Connect (OSTI)

    Nelson, George J.; Harris, William H.; Lombardo, Jeffrey J.; Izzo, Jr., John R.; Chiu, W. K. S.; Tanasini, Pietro; cantoni, Marco; Van herle, Jan; Comninellis, Christos; Andrews, Joy C.; Liu, Yijin; Pianetta, Piero; Chu, Yong

    2011-01-01T23:59:59.000Z

    X-ray nanotomography and focused ion beam scanning electron microscopy (FIB?SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIB–SEM enable elemental mapping within the microstructure. Using these methods, non?destructive 3D x-ray imaging and FIB–SEM serial sectioning have been applied to compare three?dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

  10. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images

    SciTech Connect (OSTI)

    Gonnissen, J.; De Backer, A.; Martinez, G. T.; Van Aert, S., E-mail: Sandra.VanAert@uantwerpen.be [Electron Microscopy for Materials Science, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp (Belgium); Dekker, A. J. den [iMinds-Vision Lab, University of Antwerp, Universiteitsplein 1, 2610 Wilrijk (Belgium); Delft Center for Systems and Control, Delft University of Technology, Mekelweg 2, 2628 CD Delft (Netherlands); Rosenauer, A. [Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee NW1, 28359 Bremen (Germany); Sijbers, J. [iMinds-Vision Lab, University of Antwerp, Universiteitsplein 1, 2610 Wilrijk (Belgium)

    2014-08-11T23:59:59.000Z

    We report an innovative method to explore the optimal experimental settings to detect light atoms from scanning transmission electron microscopy (STEM) images. Since light elements play a key role in many technologically important materials, such as lithium-battery devices or hydrogen storage applications, much effort has been made to optimize the STEM technique in order to detect light elements. Therefore, classical performance criteria, such as contrast or signal-to-noise ratio, are often discussed hereby aiming at improvements of the direct visual interpretability. However, when images are interpreted quantitatively, one needs an alternative criterion, which we derive based on statistical detection theory. Using realistic simulations of technologically important materials, we demonstrate the benefits of the proposed method and compare the results with existing approaches.

  11. Investigation of Band-Offsets at Monolayer-Multilayer MoS2 Junctions by Scanning Photocurrent Microscopy

    E-Print Network [OSTI]

    Howell, Sarah L; Wu, Chung-Chiang; Chen, Kan-Sheng; Sangwan, Vinod K; Kang, Junmo; Marks, Tobin J; Hersam, Mark C; Lauhon, Lincoln J

    2015-01-01T23:59:59.000Z

    The thickness-dependent band structure of MoS2 implies that discontinuities in energy bands exist at the interface of monolayer (1L) and multilayer (ML) thin films. The characteristics of such heterojunctions are analyzed here using current versus voltage measurements, scanning photocurrent microscopy, and finite element simulations of charge carrier transport. Rectifying I-V curves are consistently observed between contacts on opposite sides of 1L-ML junctions, and a strong bias-dependent photocurrent is observed at the junction. Finite element device simulations with varying carrier concentrations and electron affinities show that a type II band alignment at single layer/multi-layer junctions reproduces both the rectifying electrical characteristics and the photocurrent response under bias. However, the zero-bias junction photocurrent and its energy dependence are not explained by conventional photovoltaic and photothermoelectric mechanisms, indicating the contributions of hot carriers.

  12. Electrical transport and mechanical properties of alkylsilane self-assembled monolayers on silicon surfaces probed by atomic force microscopy

    SciTech Connect (OSTI)

    Park, Jeong Young; Qi, Yabing; Ashby, Paul D.; Hendriksen, Bas L.M.; Salmeron, Miquel

    2009-02-06T23:59:59.000Z

    The correlation between molecular conductivity and mechanical properties (molecular deformation and frictional responses) of hexadecylsilane self-assembled monolayers was studied with conductive probe atomic force microscopy/friction force microscopy in ultrahigh vacuum. Current and friction were measured as a function of applied pressure, simultaneously, while imaging the topography of self-assembled monolayer molecule islands and silicon surfaces covered with a thin oxide layer. Friction images reveal lower friction over the molecules forming islands than over the bare silicon surface, indicating the lubricating functionality of alkylsilane molecules. By measuring the tunneling current change due to changing of the height of the molecular islands by tilting the molecules under pressure from the tip, we obtained an effective conductance decay constant ({beta}) of 0.52/{angstrom}.

  13. Spectral multiplexing using quantum dot tagged microspheres with diffusing colloidal probe microscopy

    E-Print Network [OSTI]

    Muthukumar, Shankarapandian

    2009-05-15T23:59:59.000Z

    (TIRM) and Video Microscopy to simultaneously measure multiple particle-surface interactions with nanometer resolution in particle-surface separation. By acquiring the scattered intensity emitted by the particles, the separation distance can...

  14. EMSL - Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microscopy Capability Details * Electron microscopes with tomography, cryo, scanning, photoemission and high-resolution (sub-nanometer) imaging capabilities* Focused ion beam...

  15. A 4 K cryogenic probe for use in magnetic resonance force microscopy experiments

    SciTech Connect (OSTI)

    Smith, Doran D.; Alexson, Dimitri A. [U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, Maryland 20783 (United States)] [U.S. Army Research Laboratory, 2800 Powder Mill Road, Adelphi, Maryland 20783 (United States); Garbini, Joseph L. [Mechanical Engineering, University of Washington, Seattle, Washington 98195 (United States)] [Mechanical Engineering, University of Washington, Seattle, Washington 98195 (United States)

    2013-09-15T23:59:59.000Z

    The detailed design of a mechanically detected nuclear magnetic resonance probe using the SPAM (Springiness Preservation by Aligning Magnetization) geometry, operating at 4 K, in vacuum, and a several-Tesla magnetic field is described. The probe head is vibration-isolated well enough from the environment by a three-spring suspension system that the cantilever achieves thermal equilibrium with the environment without the aid of eddy current damping. The probe uses an ultra-soft Si cantilever with a Ni sphere attached to its tip, and magnetic resonance is registered as a change in the resonant frequency of the driven cantilever. The RF system uses frequency sweeps for adiabatic rapid passage using a 500 ?m diameter RF coil wound around a sapphire rod. The RF coil and optical fiber of the interferometer used to sense the cantilever's position are both located with respect to the cantilever using a Garbini micropositioner, and the sample stage is mounted on an Attocube nanopositioner.

  16. Factors influencing quantitative liquid (scanning) transmission...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Factors influencing quantitative liquid (scanning) transmission electron microscopy. Factors influencing quantitative liquid (scanning) transmission electron microscopy. Abstract:...

  17. Cell Detection in Knife-Edge Scanning Microscopy Images of Nissl-stained Mouse and Rat Brain Samples Using Random Forests

    E-Print Network [OSTI]

    Lal Das, Shashwat

    2014-11-26T23:59:59.000Z

    Microscopy has developed into a very powerful medium for studying the brain. The Knife-Edge Scanning Microscope (KESM), for example, is capable of imaging whole rat and mouse brains in three dimensions, and produces over 1.5 terabytes of images per...

  18. Application of Scanning Transmission X-ray Microscopy to the Rubber Industry D.A. Winesett*, H. Ade, A.P. Smith**, and S.G. Urquhart***

    E-Print Network [OSTI]

    Application of Scanning Transmission X-ray Microscopy to the Rubber Industry D.A. Winesett*, H. Ade ExxonMobil Research and Engineering Company Annandale, NJ 08801 Presented at the 2002 ACS Rubber in the rubber industry are usually multi- component systems composed of several elastomers and various fillers

  19. The growth of epitaxial iron oxides on platinum (111) as studied by X-ray photoelectron diffraction, scanning tunneling microscopy, and low energy electron diffraction

    SciTech Connect (OSTI)

    Kim, Y.J.

    1995-05-01T23:59:59.000Z

    Three complementary surface structure probes, x-ray photoelectron diffraction (XPD), scanning tunneling microscopy (STM), and low-energy electron diffraction (LEED) have been combined in a single instrument. This experimental system has been utilized to study the structure and growth mechanisms of iron oxide films on Pt(111); these films were formed by first depositing a single overlayer of Fe with a certain coverage in monolayers (ML`s), and then thermally oxidizing it in an oxygen atmosphere. For films up to {approximately}1 ML in thickness, a bilayer of Fe and O similar to those in FeO(111) is found to form. In agreement with prior studies, STM and LEED show this to be an incommensurate oxide film forming a lateral superlattice with short- and long-range periodicities of {approximately}3.1 {Angstrom} and {approximately}26.0 {Angstrom}. XPD in addition shows a topmost oxygen layer to be relaxed inward by -0.6 {Angstrom} compared to bulk FeO(111), and these are new structural conclusions. The oxygen stacking in the FeO(111) bilayer is dominated by one of two possible binding sites. For thicker iron oxide films from 1.25 ML to 3.0 ML, the growth mode is essentially Stranski-Krastanov: iron oxide islands form on top of the FeO(111) bilayer mentioned above. For iron oxide films of 3.0 ML thickness, x-ray photoelectron spectroscopy (XPS) yields an Fe 2p{sub 3/2} binding energy and an Fe:O stoichiometry consistent with the presence of Fe{sub 3}O{sub 4}. Our XPD data further prove this overlayer to be Fe{sub 3}O{sub 4}(111)-magnetite in two almost equally populated domains with a 180{degrees} rotation between them. The structural parameters for this Fe{sub 3}O{sub 4} overlayer generally agree with those of a previous LEED study, except that we find a significant difference in the first Fe-O interplanar spacing. This work demonstrates the considerable benefits to be derived by using this set of complementary surface structure probes in such epitaxial growth studies.

  20. Characterization of one-dimensional molecular chains of 4,4'-biphenyl diisocyanide on Au(111) by scanning tunneling microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhou, Jing [Univ. of Stony Brook, Stony Brook, NY (United States); White, Michael G. [Univ. of Stony Brook, Stony Brook, NY (United States); Brookhaven National Lab. (BNL), Upton, NY (United States); Li, Yan [Brookhaven National Lab. (BNL), Upton, NY (United States); Zahl, Percy [Brookhaven National Lab. (BNL), Upton, NY (United States); Sutter, Peter [Brookhaven National Lab. (BNL), Upton, NY (United States); Stacchiola, Dario J. [Brookhaven National Lab. (BNL), Upton, NY (United States)

    2015-03-14T23:59:59.000Z

    The morphology and electronic structure of vapor deposited 4,4'-biphenyldiisocyanide (BPDI) on a Au(111) surface were investigated using variable-temperature scanning tunneling microscopy (STM). When deposited at room temperature, BPDI molecules form one-dimensional molecular chains similar to that recently observed for the structurally related 1,4-phenyl diisocyanide (PDI). Compared to PDI, the longer periodicity for the BPDI molecular chains is consistent with the addition of a second phenyl ring and supports a structural model in which the BPDI molecules lie parallel to the surface and interconnected by Au-adatoms. The molecular chains are mostly aligned along the [110] direction of the Au(111) substrate, but exhibit frequent changes in angle that are consistent with directions between fcc and hcp three-fold hollow sites. Dispersion-corrected density functional theory calculations for one-dimensional chains of BPDI molecules bound end-to-end via their isocyanide groups to Au-adatoms reproduce the observed periodicity of the chains and show that this morphology is energetically favored over upright binding with one free –NC group. The spatially resolved conductance (dI/dV) map for BPDI on Au(111) exhibits a feature centered at -0.67 eV below the Fermi level which are delocalized along the chain with maxima at the Au-adatom and biphenyl positions. This occupied resonant feature is close to that previously observed for the PDI in both photoemission and conductance measurements and is attributed to an occupied interfacial state resulting from BPDI-Au interactions

  1. Characterization of one-dimensional molecular chains of 4,4'-biphenyl diisocyanide on Au(111) by scanning tunneling microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhou, Jing; White, Michael G.; Li, Yan; Zahl, Percy; Sutter, Peter; Stacchiola, Dario J.

    2015-03-14T23:59:59.000Z

    The morphology and electronic structure of vapor deposited 4,4'-biphenyldiisocyanide (BPDI) on a Au(111) surface were investigated using variable-temperature scanning tunneling microscopy (STM). When deposited at room temperature, BPDI molecules form one-dimensional molecular chains similar to that recently observed for the structurally related 1,4-phenyl diisocyanide (PDI). Compared to PDI, the longer periodicity for the BPDI molecular chains is consistent with the addition of a second phenyl ring and supports a structural model in which the BPDI molecules lie parallel to the surface and interconnected by Au-adatoms. The molecular chains are mostly aligned along the [110] direction of the Au(111) substrate, butmore »exhibit frequent changes in angle that are consistent with directions between fcc and hcp three-fold hollow sites. Dispersion-corrected density functional theory calculations for one-dimensional chains of BPDI molecules bound end-to-end via their isocyanide groups to Au-adatoms reproduce the observed periodicity of the chains and show that this morphology is energetically favored over upright binding with one free –NC group. The spatially resolved conductance (dI/dV) map for BPDI on Au(111) exhibits a feature centered at -0.67 eV below the Fermi level which are delocalized along the chain with maxima at the Au-adatom and biphenyl positions. This occupied resonant feature is close to that previously observed for the PDI in both photoemission and conductance measurements and is attributed to an occupied interfacial state resulting from BPDI-Au interactions« less

  2. Nanoscale magnetic field mapping with a single spin scanning probe magnetometer

    SciTech Connect (OSTI)

    Rondin, L.; Tetienne, J.-P.; Spinicelli, P.; Roch, J.-F.; Jacques, V. [Laboratoire de Photonique Quantique et Moleculaire, Ecole Normale Superieure de Cachan and CNRS UMR 8537, 94235 Cachan Cedex (France); Dal Savio, C.; Karrai, K. [Attocube systems AG, Koeniginstrasse 11A RGB, Munich 80539 (Germany); Dantelle, G. [Laboratoire de Physique de la Matiere Condensee, Ecole Polytechnique and CNRS UMR 7643, 91128 Palaiseau (France); Thiaville, A.; Rohart, S. [Laboratoire de Physique des Solides, Universite Paris-Sud and CNRS UMR 8502, 91405 Orsay (France)

    2012-04-09T23:59:59.000Z

    We demonstrate quantitative magnetic field mapping with nanoscale resolution, by applying a lock-in technique on the electron spin resonance frequency of a single nitrogen-vacancy defect placed at the apex of an atomic force microscope tip. In addition, we report an all-optical magnetic imaging technique which is sensitive to large off-axis magnetic fields, thus extending the operation range of diamond-based magnetometry. Both techniques are illustrated by using a magnetic hard disk as a test sample. Owing to the non-perturbing and quantitative nature of the magnetic probe, this work should open up numerous perspectives in nanomagnetism and spintronics.

  3. Controlled-Resonant Surface Tapping-Mode Scanning Probe Electrospray Ionization Mass Spectrometry Imaging

    SciTech Connect (OSTI)

    Lorenz, Matthias [ORNL] [ORNL; Ovchinnikova, Olga S [ORNL] [ORNL; Kertesz, Vilmos [ORNL] [ORNL; Van Berkel, Gary J [ORNL] [ORNL

    2014-01-01T23:59:59.000Z

    This paper reports on the advancement of a controlled-resonance surface tapping-mode single capillary liquid junction extraction/ESI emitter for mass spectrometry imaging. The basic instrumental setup and the general operation of the system were discussed and optimized performance metrics were presented. The ability to spot sample, lane scan and chemically image in an automated and controlled fashion were demonstrated. Rapid, automated spot sampling was demonstrated for a variety of compound types including the cationic dye basic blue 7, the oligosaccharide cellopentaose, and the protein equine heart cytochrome c. The system was used for lane scanning and chemical imaging of the cationic dye crystal violet in inked lines on glass and for lipid distributions in mouse brain thin tissue sections. Imaging of the lipids in mouse brain tissue under optimized conditions provided a spatial resolution of approximately 35 m based on the ability to distinguish between features observed both in the optical and mass spectral chemical images. The sampling spatial resolution of this system was comparable to the best resolution that has been reported for other types of atmospheric pressure liquid extraction-based surface sampling/ionization techniques used for mass spectrometry imaging.

  4. Potential variations around grain boundaries in impurity-doped BaSi? epitaxial films evaluated by Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Tsukahara, D.; Baba, M.; Honda, S.; Toko, K. [Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573 (Japan); Imai, Y. [Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573 (Japan); AIST, Tsukuba, Ibaraki 305-8565 (Japan); Hara, K. O.; Usami, N. [Graduate School of Engineering, Nagoya University, Nagoya 464-8603 (Japan); Japan Science and Technology Agency, CREST, Chiyoda, Tokyo 102-0075 (Japan); Werner, J. H. [Institute for Photovoltaics, University of Stuttgart, Stuttgart 70569 (Germany); Suemasu, T. [Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573 (Japan); Japan Science and Technology Agency, CREST, Chiyoda, Tokyo 102-0075 (Japan); Institute for Photovoltaics, University of Stuttgart, Stuttgart 70569 (Germany)

    2014-09-28T23:59:59.000Z

    Potential variations around the grain boundaries (GBs) in antimony (Sb)-doped n-type and boron (B)-doped p-type BaSi? epitaxial films on Si(111) were evaluated by Kelvin probe force microscopy. Sb-doped n-BaSi? films exhibited positively charged GBs with a downward band bending at the GBs. The average barrier height for holes was approximately 10 meV for an electron concentration n ? 10¹? cm?³. This downward band bending changed to upward band bending when n was increased to n = 1.8 × 10¹?cm?³. In the B-doped p-BaSi? films, the upward band bending was observed for a hole concentration p ? 10¹?cm?³. The average barrier height for electrons decreased from approximately 25 to 15 meV when p was increased from p = 2.7 × 10¹? to p = 4.0 × 10¹? cm?³. These results are explained under the assumption that the position of the Fermi level E{sub f} at GBs depends on the degree of occupancy of defect states at the GBs, while E{sub f} approached the bottom of the conduction band or the top of the valence band in the BaSi? grain interiors with increasing impurity concentrations. In both cases, such small barrier heights may not deteriorate the carrier transport properties. The electronic structures of impurity-doped BaSi? are also discussed using first-principles pseudopotential method to discuss the insertion sites of impurity atoms and clarify the reason for the observed n-type conduction in the Sb-doped BaSi? and p-type conduction in the B-doped BaSi?.

  5. Rumen microbial degradation of the top internode of maize Co125 and maize W401 observed by scanning electron microscopy

    E-Print Network [OSTI]

    Paris-Sud XI, Université de

    Rumen microbial degradation of the top internode of maize Co125 and maize W401 observed by scanning, respectively. Observations before and after degradation in the rumen of the top and the bottom of the upper on the tissues were observed. Cell- wall degradation began in the parenchyma and the phloem from the bottom of Co

  6. A robust, scanning quantum system for nanoscale sensing and imaging

    E-Print Network [OSTI]

    P. Maletinsky; S. Hong; M. S. Grinolds; B. Hausmann; M. D. Lukin; R. -L. Walsworth; M. Loncar; A. Yacoby

    2011-08-22T23:59:59.000Z

    Controllable atomic-scale quantum systems hold great potential as sensitive tools for nanoscale imaging and metrology. Possible applications range from nanoscale electric and magnetic field sensing to single photon microscopy, quantum information processing, and bioimaging. At the heart of such schemes is the ability to scan and accurately position a robust sensor within a few nanometers of a sample of interest, while preserving the sensor's quantum coherence and readout fidelity. These combined requirements remain a challenge for all existing approaches that rely on direct grafting of individual solid state quantum systems or single molecules onto scanning-probe tips. Here, we demonstrate the fabrication and room temperature operation of a robust and isolated atomic-scale quantum sensor for scanning probe microscopy. Specifically, we employ a high-purity, single-crystalline diamond nanopillar probe containing a single Nitrogen-Vacancy (NV) color center. We illustrate the versatility and performance of our scanning NV sensor by conducting quantitative nanoscale magnetic field imaging and near-field single-photon fluorescence quenching microscopy. In both cases, we obtain imaging resolution in the range of 20 nm and sensitivity unprecedented in scanning quantum probe microscopy.

  7. Direct imaging of light elements by annular dark-field aberration-corrected scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Lotnyk, Andriy, E-mail: andriy.lotnyk@iom-leipzig.de; Poppitz, David; Gerlach, Jürgen W.; Rauschenbach, Bernd [Leibniz Institute of Surface Modification, Permoserstr. 15, D-04318 Leipzig (Germany)

    2014-02-17T23:59:59.000Z

    In this report, we show that an annular dark-field detector in an aberration-corrected scanning transmission electron microscope allows the direct observation of light element columns in crystalline lattices. At specific imaging conditions, an enhancement of the intensities of light element columns in the presence of heavy element columns is observed. Experimental results are presented for imaging the nitrogen and carbon atomic columns at the GaN-SiC interface and within the GaN and SiC compounds. The crystal polarity of GaN at the interface is identified. The obtained findings are discussed and are well supported by image simulations.

  8. Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Harumoto, T. [Department of Metallurgy and Ceramics Science, Tokyo Institute of Technology, 2-12-1-S8-6 O-okayama, Meguro-ku, Tokyo 152-8552 (Japan); Department of Materials Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510 (Japan); Sannomiya, T.; Matsukawa, Y.; Muraishi, S.; Shi, J.; Nakamura, Y. [Department of Metallurgy and Ceramics Science, Tokyo Institute of Technology, 2-12-1-S8-6 O-okayama, Meguro-ku, Tokyo 152-8552 (Japan); Sawada, H. [Japan Electron Optics Laboratory (JEOL) Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558 (Japan); Tanaka, T.; Tanishiro, Y.; Takayanagi, K. [Department of Physics, Tokyo Institute of Technology, 2-12-1-H-51 O-okayama, Meguro-ku, Tokyo 152-8551 (Japan)

    2013-02-28T23:59:59.000Z

    The polarity determination process of sputter-deposited aluminum nitride (AlN) on metals has been analyzed using aberration corrected atomic resolution scanning transmission electron microscope. Direct growth of c-axis orientated AlN on face centered cubic metals (fcc) (111) with the local epitaxy has been observed, and the polarity was determined at the AlN/metal interface. We found that the AlN polarity can be controlled by the base metal layer: N-polarity AlN grows on Pt(111) while Al-polarity AlN forms on Al(111). Based on these results, the growth mechanism of AlN on metals is discussed.

  9. Iron on GaN(0001) pseudo-1?×?1 (1+1/(12) ) investigated by scanning tunneling microscopy and first-principles theory

    SciTech Connect (OSTI)

    Lin, Wenzhi; Mandru, Andrada-Oana; Smith, Arthur R., E-mail: smitha2@ohio.edu [Department of Physics and Astronomy, Nanoscale and Quantum Phenomena Institute, Ohio University, Athens, Ohio 45701 (United States); Takeuchi, Noboru [Centro de Nanociencias y Nanotecnologia, Universidad Nacional Autonoma de Mexico Apartado Postal 14, Ensenada Baja California, Codigo Postal 22800 (Mexico); Al-Brithen, Hamad A. H. [Physics and Astronomy Department, King Abdulah Institute for Nanotechnology, King Saud University, Riyadh, Saudi Arabia, and National Center for Nano Technology, KACST, Riyadh (Saudi Arabia)

    2014-04-28T23:59:59.000Z

    We have investigated sub-monolayer iron deposition on atomically smooth GaN(0001) pseudo-1?×?1 (1+1/(12) ). The iron is deposited at a substrate temperature of 360?°C, upon which reflection high energy electron diffraction shows a transformation to a ?(3)×?(3)-R30° pattern. After cooling to room temperature, the pattern transforms to a 6?×?6, and scanning tunneling microscopy reveals 6?×?6 reconstructed regions decorating the GaN step edges. First-principles theoretical calculations have been carried out for a range of possible structural models, one of the best being a Ga dimer model consisting of 2/9 monolayer of Fe incorporated into 7/3 monolayer of Ga in a relaxed but distorted structure.

  10. Infrared Scattering Scanning Near-Field Optical Microscopy Using An External Cavity Quantum Cascade Laser For Nanoscale Chemical Imaging And Spectroscopy of Explosive Residues

    SciTech Connect (OSTI)

    Craig, Ian M.; Phillips, Mark C.; Taubman, Matthew S.; Josberger, Erik E.; Raschke, Markus Bernd

    2013-02-04T23:59:59.000Z

    Infrared scattering scanning near-field optical microscopy (s-SNOM) is an apertureless superfocusing technique that uses the antenna properties of a conducting atomic force microscope (AFM) tip to achieve infrared spatial resolution below the diffraction limit. The instrument can be used either in imaging mode, where a fixed wavelength light source is tuned to a molecular resonance and the AFM raster scans an image, or in spectroscopy mode where the AFM is held stationary over a feature of interest and the light frequency is varied to obtain a spectrum. In either case, a strong, stable, coherent infrared source is required. Here we demonstrate the integration of a broadly tunable external cavity quantum cascade laser (ECQCL) into an s-SNOM and use it to obtain infrared spectra of microcrystals of chemicals adsorbed onto gold substrates. Residues of the explosive compound tetryl was deposited onto gold substrates. s-SNOM experiments were performed in the 1260-1400 cm?1 tuning range of the ECQCL, corresponding to the NO2 symmetric stretch vibrational fingerprint region. Vibrational infrared spectra were collected on individual chemical domains with a collection area of *500nm2 and compared to ensemble averaged far-field reflection-absorption infrared spectroscopy (RAIRS) results.

  11. The ReactorSTM: Atomically resolved scanning tunneling microscopy under high-pressure, high-temperature catalytic reaction conditions

    SciTech Connect (OSTI)

    Herbschleb, C. T.; Tuijn, P. C. van der; Roobol, S. B.; Navarro, V.; Bakker, J. W.; Liu, Q.; Stoltz, D.; Cañas-Ventura, M. E.; Verdoes, G.; Spronsen, M. A. van; Bergman, M.; Crama, L.; Taminiau, I.; Frenken, J. W. M., E-mail: frenken@physics.leidenuniv.nl [Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden (Netherlands); Ofitserov, A.; Baarle, G. J. C. van [Leiden Probe Microscopy B.V., J.H. Oortweg 21, 2333 CH Leiden (Netherlands)

    2014-08-15T23:59:59.000Z

    To enable atomic-scale observations of model catalysts under conditions approaching those used by the chemical industry, we have developed a second generation, high-pressure, high-temperature scanning tunneling microscope (STM): the ReactorSTM. It consists of a compact STM scanner, of which the tip extends into a 0.5 ml reactor flow-cell, that is housed in a ultra-high vacuum (UHV) system. The STM can be operated from UHV to 6 bars and from room temperature up to 600 K. A gas mixing and analysis system optimized for fast response times allows us to directly correlate the surface structure observed by STM with reactivity measurements from a mass spectrometer. The in situ STM experiments can be combined with ex situ UHV sample preparation and analysis techniques, including ion bombardment, thin film deposition, low-energy electron diffraction and x-ray photoelectron spectroscopy. The performance of the instrument is demonstrated by atomically resolved images of Au(111) and atom-row resolution on Pt(110), both under high-pressure and high-temperature conditions.

  12. Serial and parallel Si, Ge, and SiGe direct-write with scanning probes and conducting stamps

    SciTech Connect (OSTI)

    Vasko, Stephanie E.; Kapetanovic, Adnan; Talla, Vamsi; Brasino, Michael D.; Zhu, Zihua; Scholl, Andreas; Torrey, Jessica D.; Rolandi, Marco

    2011-05-16T23:59:59.000Z

    Precise materials integration in nanostructures is fundamental for future electronic and photonic devices. We demonstrate Si, Ge, and SiGe nanostructure direct-write with deterministic size, geometry, and placement control. The biased probe of an atomic force microscope (AFM) reacts diphenylsilane or diphenylgermane to direct-write carbon-free Si, Ge, and SiGe nano and heterostructures. Parallel directwrite is available on large areas by substituting the AFM probe with conducting microstructured stamps. This facile strategy can be easily expanded to a broad variety of semiconductor materials through precursor selection.

  13. Direct comparison between X-ray nanotomography and scanning electron microscopy for the microstructure characterization of a solid oxide fuel cell anode

    SciTech Connect (OSTI)

    Quey, R., E-mail: quey@emse.fr [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); École des Mines de Saint-Étienne, CNRS UMR 5307, 158 cours Fauriel, 42023 Saint-Étienne, Cedex 2 (France); Suhonen, H., E-mail: heikki.suhonen@esrf.fr [European Synchrotron Radiation Facility (ESRF), 6 Rue Jules Horowitz BP 220, 38043 Grenoble (France); Laurencin, J., E-mail: jerome.laurencin@cea.fr [CEA-Liten, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Cloetens, P., E-mail: peter.cloetens@esrf.fr [European Synchrotron Radiation Facility (ESRF), 6 Rue Jules Horowitz BP 220, 38043 Grenoble (France); Bleuet, P., E-mail: pierre.bleuet@cea.fr [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France)

    2013-04-15T23:59:59.000Z

    X-ray computed nanotomography (nano-CT) and scanning electron microscopy (SEM) have been applied to characterize the microstructure of a Solid Oxide Fuel Cell (SOFC) anode. A direct comparison between the results of both methods is conducted on the same region of the microstructure to assess the spatial resolution of the nano-CT microstructure, SEM being taken as a reference. A registration procedure is proposed to find out the position of the SEM image within the nano-CT volume. It involves a second SEM observation, which is taken along an orthogonal direction and gives an estimate reference SEM image position, which is then refined by an automated optimization procedure. This enables an unbiased comparison between the cell porosity morphologies provided by both methods. In the present experiment, nano-CT is shown to underestimate the number of pores smaller than 1 ?m and overestimate the size of the pores larger than 1.5 ?m. - Highlights: ? X-ray computed nanotomography (nano-CT) and SEM are used to characterize an SOFC anode. ? A methodology is proposed to compare the nano-CT and SEM data on the same region. ? The spatial resolution of the nano-CT data is assessed from that comparison.

  14. Scanning tunneling microscopy of dimeric and polymeric products of electroreduced (Re(CO) sub 3 (4-vinyl,4 prime -methyl-2,2 prime -bipyridine)Cl)

    SciTech Connect (OSTI)

    Snyder, S.R.; White, H.S. (Univ. of Minnesota, Minneapolis (USA)); Lopez, S.; Abruna, H.D. (Cornell Univ., Ithaca, NY (USA))

    1990-02-14T23:59:59.000Z

    Scanning tunneling microscopy (STM) was used to image adsorbed products resulting from electroreduction of (Re(CO){sub 3}(vbpy)Cl) (vbpy = 4-vinyl,4{prime}-methyl-2,2{prime}-bipyridine) on highly oriented pyrolytic graphite (HOPG). STM images, in air, of HOPG electrodes following electroreduction of (Re(CO){sub 3}(vbpy)Cl) (in acetonitrile/0.1 M tetra-n-butylammonium perchlorate) by cycling the potential between 0 and {minus}2.0 V vs a sodium saturated colomel electrode (SSCE) show molecular species uniformly distributed on the surface including approximately dumbbell shaped molecules ({approx} 40 {times} 20 {angstrom}). The size and shape of these aggregates is consistent with products derived from vinyl-vinvyl coupling of Re-Re bonded dimers: ((vbpy)(CO){sub 3}Re-Re(CO){sub 3}(vbpyH-vbpyH)(CO){sub 3}Re-Re(CO){sub 3}(vbpy)). STM images of electrodes prepared by cycling the potential between 0 and {minus}1.45 V vs SSCE (less reducing conditions) show highly nonuniform coating of the surface by polymer. Several polymer morphologies were observed with polymer nucleation preferentially occurring at step sites on HOPG.

  15. Scanning Electron Microscopy Analysis of Fuel/Matrix Interaction Layers in Highly-Irradiated U–Mo Dispersion Fuel Plates with Al and Al–Si Alloy Matrices

    SciTech Connect (OSTI)

    Dennis D. Keiser, Jr.; Jan-Fong Jue; Brandon D. Miller; Jian Gan; Adam B. Robinson; Pavel Medvedev; James Madden; Dan Wachs; Mitch Meyer

    2014-04-01T23:59:59.000Z

    In order to investigate how the microstructure of fuel/matrix-interaction (FMI) layers change during irradiation, different U–7Mo dispersion fuel plates have been irradiated to high fission density and then characterized using scanning electron microscopy (SEM). Specifially, samples from irradiated U–7Mo dispersion fuel elements with pure Al, Al–2Si and AA4043 (~4.5 wt.%Si) matrices were SEM characterized using polished samples and samples that were prepared with a focused ion beam (FIB). Features not observable for the polished samples could be captured in SEM images taken of the FIB samples. For the Al matrix sample, a relatively large FMI layer develops, with enrichment of Xe at the FMI layer/Al matrix interface and evidence of debonding. Overall, a significant penetration of Si from the FMI layer into the U–7Mo fuel was observed for samples with Si in the Al matrix, which resulted in a change of the size (larger) and shape (round) of the fission-gas bubbles. Additionally, solid-fission-product phases were observed to nucleate and grow within these bubbles. These changes in the localized regions of the microstructure of the U–7Mo may contribute to changes observed in the macroscopic swelling of fuel plates with Al–Si matrices.

  16. In-Situ Transmission Electron Microscopy Probing of Native Oxide and Artificial Layers on Silicon Nanoparticles for Lithium Ion Batteries

    SciTech Connect (OSTI)

    He, Yang; Piper, Daniela M.; Gu, Meng; Travis, Jonathan J.; George, Steven M.; Lee, Se-Hee; Genc, Arda; Pullan, Lee; Liu, Jun; Mao, Scott X.; Zhang, Jiguang; Ban, Chunmei; Wang, Chong M.

    2014-10-27T23:59:59.000Z

    Surface modification of silicon nanoparticle via molecular layer deposition (MLD) has been recently proved to be an effective way for dramatically enhancing the cyclic performance in lithium ion batteries. However, the fundamental mechanism as how this thin layer of coating function is not known, which is even complicated by the inevitable presence of native oxide of several nanometers on the silicon nanoparticle. Using in-situ TEM, we probed in detail the structural and chemical evolution of both uncoated and coated silicon particles upon cyclic lithiation/delithation. We discovered that upon initial lithiation, the native oxide layer converts to crystalline Li2O islands, which essentially increases the impedance on the particle, resulting in ineffective lithiation/delithiation, and therefore low coulombic efficiency. In contrast, the alucone MLD coated particles show extremely fast, thorough and highly reversible lithiation behaviors, which are clarified to be associated with the mechanical flexibility and fast Li+/e- conductivity of the alucone coating. Surprisingly, the alucone MLD coating process chemically changes the silicon surface, essentially removing the native oxide layer and therefore mitigates side reaction and detrimental effects of the native oxide. This study provides a vivid picture of how the MLD coating works to enhance the coulombic efficiency and preserve capacity and clarifies the role of the native oxide on silicon nanoparticles during cyclic lithiation and delithiation. More broadly, this work also demonstrated that the effect of the subtle chemical modification of the surface during the coating process may be of equal importance as the coating layer itself.

  17. Direct imaging of crystal structure and defects in metastable Ge{sub 2}Sb{sub 2}Te{sub 5} by quantitative aberration-corrected scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Ross, Ulrich; Lotnyk, Andriy, E-mail: andriy.lotnyk@iom-leipzig.de; Thelander, Erik; Rauschenbach, Bernd [Leibniz Institute of Surface Modification, Permoserstr. 15, D-04318 Leipzig (Germany)

    2014-03-24T23:59:59.000Z

    Knowledge about the atomic structure and vacancy distribution in phase change materials is of foremost importance in order to understand the underlying mechanism of fast reversible phase transformation. In this Letter, by combining state-of-the-art aberration-corrected scanning transmission electron microscopy with image simulations, we are able to map the local atomic structure and composition of a textured metastable Ge{sub 2}Sb{sub 2}Te{sub 5} thin film deposited by pulsed laser deposition with excellent spatial resolution. The atomic-resolution scanning transmission electron microscopy investigations display the heterogeneous defect structure of the Ge{sub 2}Sb{sub 2}Te{sub 5} phase. The obtained results are discussed. Highly oriented Ge{sub 2}Sb{sub 2}Te{sub 5} thin films appear to be a promising approach for further atomic-resolution investigations of the phase change behavior of this material class.

  18. Scanning Josephson Tunneling Microscopy of Single Crystal Bi2Sr2CaCu2O8+delta with a Conventional Superconducting Tip

    E-Print Network [OSTI]

    Kimura, H.

    2010-01-01T23:59:59.000Z

    +? with a Conventional Superconducting Tip Hikari Kimura,1,2between a conventional superconducting scanning tunnelinginhomogeneity in the superconductivity of BSCCO. The

  19. Scanning Tunneling Spectroscopy of Graphene and Magnetic Nanostructures

    E-Print Network [OSTI]

    Brar, Victor Watson

    2010-01-01T23:59:59.000Z

    C. J. Chen, Introduction to Scanning Tunneling Microscopy (Scanning Tunneling Spectroscopy of Graphene and MagneticAli Javey Fall 2010 Scanning Tunneling Spectroscopy of

  20. Electron Microscopy | Center for Functional Nanomaterials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Capabilities Atomic-resolution imaging of internal materials structure with scanning transmission and transmission electron microscopy Spectroscopic characterization with...

  1. The thermoelectric properties of molecular junctions can now be investigated with scanning tunnelling microscopy. Such experiments provide insights into charge transport in single

    E-Print Network [OSTI]

    Heller, Eric

    The thermoelectric properties of molecular junctions can now be investigated with scanning . They used a scanning tunnelling microscope (STM) to investigate thermoelectricity -- the voltage generated that thermoelectric measurements by STM provide a solution to this problem MOLECULAR ELECTRONICS Charges feel the heat

  2. Novel Approaches to Soft X-ray Spectroscopy: Scanning TransmissionX-ray Microscopy and Ambient Pressure X-Ray PhotoelectronSpectroscopy

    SciTech Connect (OSTI)

    Bluhm, Hendrik; Gilles, Mary K.; Mun, Simon B.; Tyliszczak, Tolek

    2006-02-01T23:59:59.000Z

    This workshop focused on novel spectroscopies at Beamlines 11.0.2, 5.3.2 and 9.3.2 at the ALS. The workshop brought together users from a wide range of fields to highlight recent experimental and technical developments both in scanning transmission X-ray spectroscopy (STXM) and ambient pressure photoelectron spectroscopy (APPES). The morning session featured talks on experiments involving new developments at the STXM, while the afternoon session was devoted to those using APXPS. In the morning session, Tolek Tyliszczak discussed the improved detector developments at the STXM, such as an avalanche photodiode detector and fluorescence and electron detection, as well as the continued development of in situ cells for heating, gas flow, and electrochemical cells. Of these, only the avalanche photodiode in combination with a novel multichannel photon-counting system is in routine use in time-resolved studies. Bartel Van Waeyenberge (Ghent University) presented results of magnetic imaging with a time resolution of 70-100 ps combined with a lateral resolution of 20-40 nm performed with the STXM (Beamline 11.0.2). As a complement to the time-domain ''pump-and-probe'' measurements, they developed a frequency-domain ''sine-excitation'' technique in order to study specific eigenmodes of these ferromagnetic patterns with high spatial resolution. This new approach was used to study the gyrotropic vortex motions in micron-sized ferromagnetic patterns. Adam Hitchcock (McMaster University) presented the development, in collaboration with Daniel Guay (INRS, Varennes) and Sherry Zhang, of the apparatus and techniques for applying STXM to in-situ studies of electrochemistry, in particular electrochromism in polyaniline. In addition, substantial progress was reported on a joint project to develop substrates and methods for chemically selective lithography of multilayer polymer systems. Selective patterns, such as that displayed in the figure, can now be written efficiently with the bend magnet STXM on Beamline 5.3.2. Yves Acremann (SSRL) discussed time and spatially resolved X-ray magnetic circular dichroism (XMCD) experiments on spin transfer devices at the STXM (Beamline 11.0.2). These elegant experiments explore time resolved measurements of the magnetization dynamics within a 100 x 150 nm sample influenced by a spin-polarized current. This experiment shows that the magnetization in these magnetic nanostructures are not uniform, as they are influenced by the Oersted field of the charge current needed to generate the spin current. The implementation of a novel multichannel photon counting system in combination with an avalanche photon detector decreased the data-acquisition time by a factor of 10, owing to its ability to resolve the structure of multi bunch mode. Gordon E. Brown, Jr. (Stanford University and SSRL) described ''Applications of STXM to Microbial Bioweathering and Biomineralization''. In the interaction of bacteria with ferrihydrite nanoparticles, microenvironments that were very different than the bulk material were observed, showing that bulk thermodynamics may not be useful for predicting micro phases. Gordon also presented work showing that iron nanoparticles are attracted to the negatively charged bacteria and form a coating that reduces iron oxide minerals. The afternoon session started with presentations by Simon Mun and Hendrik Bluhm, who discussed the current status and the future plans for the two APPES end-stations at the ALS, which are located at Beamlines 9.3.2 and 11.0.2, respectively. In both end-stations, samples can be measured in gaseous environments at pressures of up to several Torr, which makes possible the investigation of numerous phenomena, in particular in the fields of atmospheric and environmental science as well as heterogeneous catalysis. Specific examples of the application of APPES were shown in the following presentations. John Hemminger (University of California, Irvine) reported on APPES investigations at Beamlines 9.3.2 and 11.0.2 of the interaction of alkali halide surfaces with water. The m

  3. Journal of Magnetism and Magnetic Materials 286 (2005) 324328 Light-free magnetic resonance force microscopy for studies of

    E-Print Network [OSTI]

    Journal of Magnetism and Magnetic Materials 286 (2005) 324­328 Light-free magnetic resonance force for Physical Sciences, College Park, MD, USA Available online 4 November 2004 Abstract Magnetic resonance force microscopy is a scanned probe technique capable of three-dimensional magnetic resonance imaging. Its

  4. Scanning Probe Alloying Nanolithography (SPAN)

    E-Print Network [OSTI]

    Lee, Hyungoo

    2010-07-14T23:59:59.000Z

    ..................................................................... 66 xi Page Figure 6.1 (a) Cross-sectional view for the gold-coated PVDF (b) L-shaped sensor used in the tests (c) Attachment location at the ?femur- tibia? joint is shown .............. 73 Figure 6.2 Experimental setup for roach....5 Voltage output generated by sensors attached to a roach?s leg ........ 78 Figure 6.6 The linear motorized system mimics the bending motion of the roaches? legs ............................................................................ 80 Figure...

  5. Scanning Probe Alloying Nanolithography (SPAN) 

    E-Print Network [OSTI]

    Lee, Hyungoo

    2010-07-14T23:59:59.000Z

    . The seventh section discusses the feasibility of the nanostructures to be used in biosensors and flexible devices. The conclusion of the research is summarized in the seventh section....

  6. Phase modulated multiphoton microscopy

    E-Print Network [OSTI]

    Karki, Khadga Jung; Pullerits, Tonu

    2015-01-01T23:59:59.000Z

    We show that the modulation of the phases of the laser beams of ultra-short pulses leads to modulation of the two photon fluorescence intensity. The phase modulation technique when used in multi-photon microscopy can improve the signal to noise ratio. The technique can also be used in multiplexing the signals in the frequency domain in multi-focal raster scanning microscopy. As the technique avoids the use of array detectors as well as elaborate spatiotemporal multiplexing schemes it provides a convenient means to multi-focal scanning in axial direction. We show examples of such uses. Similar methodology can be used in other non-linear scanning microscopies, such as second or third harmonic generation microscopy.

  7. Atomic-Scale Investigation of Epitaxial Graphene Grown on 6H-SiC(0001) Using Scanning Tunneling Microscopy and Spectroscopy

    E-Print Network [OSTI]

    Kim, Sehun

    Atomic-Scale Investigation of Epitaxial Graphene Grown on 6H-SiC(0001) Using Scanning Tunneling ReceiVed: June 26, 2010 Graphene was epitaxially grown on a 6H-SiC(0001) substrate by thermal the evolution of the graphene growth as a function of the temperature. We found that the evaporation of Si

  8. Probing the Superconducting Order Parameter of High-Tc Superconductor Bi2Sr2CaCu2O8+? by Scanning Josephson Tunneling Microscopy

    E-Print Network [OSTI]

    Kimura, Hikari

    2009-01-01T23:59:59.000Z

    Turner, Principles of Superconductive Devices and Circuits (P. G. de Gennes, Superconductivity , edited by R. D. Parks (Tinkham, Introduction to Superconductivity (McGraw-Hill, New

  9. Probing the Superconducting Order Parameter of High-Tc Superconductor Bi2Sr2CaCu2O8+? by Scanning Josephson Tunneling Microscopy

    E-Print Network [OSTI]

    Kimura, Hikari

    2009-01-01T23:59:59.000Z

    for the high- T C superconducting cuprates. Bibliography [Microscope …………………. 15 2-2 Superconducting STM tip and S/I/SProbing the Superconducting Order Parameter of High-T C

  10. Non-contact atomic-level interfacial force microscopy

    SciTech Connect (OSTI)

    Houston, J.E.; Fleming, J.G.

    1997-02-01T23:59:59.000Z

    The scanning force microscopies (notably the Atomic Force Microscope--AFM), because of their applicability to nearly all materials, are presently the most widely used of the scanning-probe techniques. However, the AFM uses a deflection sensor to measure sample/probe forces which suffers from an inherent mechanical instability that occurs when the rate of change of the force with respect to the interfacial separation becomes equal to the spring constant of the deflecting member. This instability dramatically limits the breadth of applicability of AFM-type techniques to materials problems. In the course of implementing a DOE sponsored basic research program in interfacial adhesion, a self-balancing force sensor concept has been developed and incorporated into an Interfacial Force Microscopy (IFM) system by Sandia scientists. This sensor eliminates the instability problem and greatly enhances the applicability of the scanning force-probe technique to a broader range of materials and materials parameters. The impact of this Sandia development was recognized in 1993 by a Department of Energy award for potential impact on DOE programs and by an R and D 100 award for one of the most important new products of 1994. However, in its present stage of development, the IFM is strictly a research-level tool and a CRADA was initiated in order to bring this sensor technology into wide-spread availability by making it accessible in the form of a commercial instrument. The present report described the goals, approach and results of this CRADA effort.

  11. Spectroscopic imaging in electron microscopy

    SciTech Connect (OSTI)

    Pennycook, Stephen J [ORNL; Colliex, C. [Universite Paris Sud, Orsay, France

    2012-01-01T23:59:59.000Z

    In the scanning transmission electron microscope, multiple signals can be simultaneously collected, including the transmitted and scattered electron signals (bright field and annular dark field or Z-contrast images), along with spectroscopic signals such as inelastically scattered electrons and emitted photons. In the last few years, the successful development of aberration correctors for the electron microscope has transformed the field of electron microscopy, opening up new possibilities for correlating structure to functionality. Aberration correction not only allows for enhanced structural resolution with incident probes into the sub-angstrom range, but can also provide greater probe currents to facilitate mapping of intrinsically weak spectroscopic signals at the nanoscale or even the atomic level. In this issue of MRS Bulletin, we illustrate the power of the new generation of electron microscopes with a combination of imaging and spectroscopy. We show the mapping of elemental distributions at atomic resolution and also the mapping of electronic and optical properties at unprecedented spatial resolution, with applications ranging from graphene to plasmonic nanostructures, and oxide interfaces to biology.

  12. Chemical Imaging Analysis of Environmental Particles Using the Focused Ion Beam/Scanning Electron Microscopy Technique: Microanalysis Insights into Atmospheric Chemistry of Fly Ash

    SciTech Connect (OSTI)

    Chen, Haihan; Grassian, Vicki H.; Saraf, Laxmikant V.; Laskin, Alexander

    2013-01-21T23:59:59.000Z

    Airborne fly ash from coal combustion may represent a source of bioavailable iron (Fe) in the open ocean. However, few studies have been made focusing on Fe speciation and distribution in coal fly ash. In this study, chemical imaging of fly ash has been performed using a dual-beam FIB/SEM (focused ion beam/scanning electron microscope) system for a better understanding of how simulated atmospheric processing modify the morphology, chemical compositions and element distributions of individual particles. A novel approach has been applied for cross-sectioning of fly ash specimen with a FIB in order to explore element distribution within the interior of individual particles. Our results indicate that simulated atmospheric processing causes disintegration of aluminosilicate glass, a dominant material in fly ash particles. Aluminosilicate-phase Fe in the inner core of fly ash particles is more easily mobilized compared with oxide-phase Fe present as surface aggregates on fly ash spheres. Fe release behavior depends strongly on Fe speciation in aerosol particles. The approach for preparation of cross-sectioned specimen described here opens new opportunities for particle microanalysis, particular with respect to inorganic refractive materials like fly ash and mineral dust.

  13. Ultrafast supercontinuum fiber-laser based pump-probe scanning magneto-optical Kerr effect microscope for the investigation of electron spin dynamics in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution

    SciTech Connect (OSTI)

    Henn, T.; Kiessling, T., E-mail: tobias.kiessling@physik.uni-wuerzburg.de; Ossau, W.; Molenkamp, L. W. [Physikalisches Institut (EP3), Universität Würzburg, 97074 Würzburg (Germany)] [Physikalisches Institut (EP3), Universität Würzburg, 97074 Würzburg (Germany); Biermann, K.; Santos, P. V. [Paul-Drude-Institut für Festkörperelektronik, 10117 Berlin (Germany)] [Paul-Drude-Institut für Festkörperelektronik, 10117 Berlin (Germany)

    2013-12-15T23:59:59.000Z

    We describe a two-color pump-probe scanning magneto-optical Kerr effect microscope which we have developed to investigate electron spin phenomena in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution. The key innovation of our microscope is the usage of an ultrafast “white light” supercontinuum fiber-laser source which provides access to the whole visible and near-infrared spectral range. Our Kerr microscope allows for the independent selection of the excitation and detection energy while avoiding the necessity to synchronize the pulse trains of two separate picosecond laser systems. The ability to independently tune the pump and probe wavelength enables the investigation of the influence of excitation energy on the optically induced electron spin dynamics in semiconductors. We demonstrate picosecond real-space imaging of the diffusive expansion of optically excited electron spin packets in a (110) GaAs quantum well sample to illustrate the capabilities of the instrument.

  14. An environmental sample chamber for reliable scanning transmission...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    environmental sample chamber for reliable scanning transmission x-ray microscopy measurements under water vapor. An environmental sample chamber for reliable scanning transmission...

  15. Subsurface Examination of a Foliar Biofilm Using Scanning Electron...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Examination of a Foliar Biofilm Using Scanning Electron- and Focused-Ion-Beam Microscopy. Subsurface Examination of a Foliar Biofilm Using Scanning Electron- and Focused-Ion-Beam...

  16. Probing Structure-Property Relationship of Energy Storage Materials Using Ex-Situ, In-Situ Dynamic Microscopy and Spectroscopy with High Spatial and Fast Temporal Resolution

    E-Print Network [OSTI]

    Probing Structure-Property Relationship of Energy Storage Materials Using Ex-Situ, In-Situ Dynamic, chemistry, and properties of energy storage materials Find general guiding principle for accelerated-situ chemical imaging and spectroscopic study of structure and chemical evolution of new energy storage

  17. Scanning tuneeling microscopy studies of fivefold surfaces of icosahedral Al-Pd-Mn quasicrystals and of thin silver films on those surfaces

    SciTech Connect (OSTI)

    Unal, Baris

    2008-12-01T23:59:59.000Z

    The present work in this dissertation mainly focuses on the clean fivefold surfaces of i-Al-Pd-Mn quasicrystals as well as the nucleation and growth of Ag films on these surfaces. In addition, Ag film growth on NiAl(110) has been explored in the frame of this dissertation. First, we have investigated the equilibration of a fivefold surface of icosahedral Al-Pd-Mn quasicrystal at 900-915 K and 925-950 K, using Omicron variable temperature scanning tunneling microscope (STM). Annealing at low temperatures resulted in many voids on some terraces while the others were almost void-free. After annealing at 925-950K, void-rich terraces became much rarer. Our STM images suggest that through growth and coalescence of the voids, a different termination becomes exposed on host terraces. All of these observations in our study indicate that even after the quasicrystalline terrace-step structure appears, it evolves with time and temperature. More specifically, based on the STM observations, we conclude that during the annealing a wide range of energetically similar layers nucleate as surface terminations, however, with increasing temperature (and time) this distribution gets narrower via elimination of the metastable void-rich terraces. Next, we have examined the bulk structural models of icosahedral Al-Pd-Mn quasicrystal in terms of the densities, compositions and interplanar spacings for the fivefold planes that might represent physical surface terminations. In our analyses, we mainly have focused on four deterministic models which have no partial or mixed occupancy but we have made some comparisons with an undeterministic model. We have compared the models with each other and also with the available experimental data including STM, LEED-IV, XPD and LEIS. In all deterministic models, there are two different families of layers (a pair of planes), and the nondeterministic model contains similar group of planes. These two families differ in terms of the chemical decoration of their top planes. Hence, we name them as Pd+(with Pd) and Pd-(without Pd). Based on their planer structure and the step height, it can be said that these two families can be viable surface terminations. However, besides the Pd content, these two sets differ in terms of relative densities of their top planes as well as the gap separating the layer from the nearest atomic plane. The experimental data and other arguments lead to the conclusion that the Pd- family is favored over the Pd+. This has an important implication on the interpretation of local motifs seen in the high resolution STM images. In other words, the dark stars are not formed by cut-Bergmans rather they are formed by cut-Mackays.

  18. katherine henderson Pathology Slide Scanning rev1 Page 1 10/21/14 Scanning in Pathology

    E-Print Network [OSTI]

    katherine henderson Pathology Slide Scanning rev1 Page 1 10/21/14 Scanning in Pathology Pathology offers several scanning methods: · Whole slide scans to be used as virtual microscopy ­ Aperio or Bioimager · Flatbed scans for gels, art work, radiology film, transparencies (12in x 17in max.) · Nikon

  19. Nanosecond switching in GeSe phase change memory films by atomic force microscopy

    SciTech Connect (OSTI)

    Bosse, James L.; Huey, Bryan D., E-mail: bhuey@ims.uconn.edu [Department of Materials Science and Engineering, 97 North Eagleville Road, Unit 3136, Storrs, Connecticut 06269-3136 (United States); Grishin, Ilya; Kolosov, Oleg V. [Department of Physics, Lancaster University, Lancaster LA1 4YB (United Kingdom); Gyu Choi, Yong [Department of Materials Science and Engineering, Korea Aerospace University, Goyang-si, Gyeonggi-do, 412-791 (Korea, Republic of); Cheong, Byung-ki; Lee, Suyoun [Electronic Materials Research Center, Korea Institute of Science and Technology, Seongbuk-gu, Seoul 136-791 (Korea, Republic of)

    2014-02-03T23:59:59.000Z

    Nanosecond scale threshold switching is investigated with conducting atomic force microscopy (AFM) for an amorphous GeSe film. Switched bits exhibit 2–3 orders of magnitude variations in conductivity, as demonstrated in phase change based memory devices. Through the nm-scale AFM probe, this crystallization was achieved with pulse durations of as low as 15?ns, the fastest reported with scanning probe based methods. Conductance AFM imaging of the switched bits further reveals correlations between the switched volume, pulse amplitude, and pulse duration. The influence of film heterogeneities on switching is also directly detected, which is of tremendous importance for optimal device performance.

  20. Characterization of multilayer nitride coatings by electron microscopy and modulus mapping

    SciTech Connect (OSTI)

    Pemmasani, Sai Pramod [International Advanced Research Centre for Powder Metallurgy and New Materials (ARCI), Balapur P.O., Hyderabad — 500005 India (India); School of Engineering Sciences and Technology, University of Hyderabad, Gachibowli, Hyderabad — 500046 India (India); Rajulapati, Koteswararao V. [School of Engineering Sciences and Technology, University of Hyderabad, Gachibowli, Hyderabad — 500046 India (India); Ramakrishna, M.; Valleti, Krishna [International Advanced Research Centre for Powder Metallurgy and New Materials (ARCI), Balapur P.O., Hyderabad — 500005 India (India); Gundakaram, Ravi C., E-mail: ravi.gundakaram@arci.res.in [International Advanced Research Centre for Powder Metallurgy and New Materials (ARCI), Balapur P.O., Hyderabad — 500005 India (India); Joshi, Shrikant V. [International Advanced Research Centre for Powder Metallurgy and New Materials (ARCI), Balapur P.O., Hyderabad — 500005 India (India)

    2013-07-15T23:59:59.000Z

    This paper discusses multi-scale characterization of physical vapour deposited multilayer nitride coatings using a combination of electron microscopy and modulus mapping. Multilayer coatings with a triple layer structure based on TiAlN and nanocomposite nitrides with a nano-multilayered architecture were deposited by Cathodic arc deposition and detailed microstructural studies were carried out employing Energy Dispersive Spectroscopy, Electron Backscattered Diffraction, Focused Ion Beam and Cross sectional Transmission Electron Microscopy in order to identify the different phases and to study microstructural features of the various layers formed as a result of the deposition process. Modulus mapping was also performed to study the effect of varying composition on the moduli of the nano-multilayers within the triple layer coating by using a Scanning Probe Microscopy based technique. To the best of our knowledge, this is the first attempt on modulus mapping of cathodic arc deposited nitride multilayer coatings. This work demonstrates the application of Scanning Probe Microscopy based modulus mapping and electron microscopy for the study of coating properties and their relation to composition and microstructure. - Highlights: • Microstructure of a triple layer nitride coating studied at multiple length scales. • Phases identified by EDS, EBSD and SAED (TEM). • Nanolayered, nanocomposite structure of the coating studied using FIB and TEM. • Modulus mapping identified moduli variation even in a nani-multilayer architecture.

  1. Characterizing Low-Permeable Granitic Rock From Micrometer to Centimeter Scale: X-ray Micro-computed Tomography, Confocal Laser Scanning Microscopy and {sup 14}C-PMMA Method

    SciTech Connect (OSTI)

    Laehdemaeki, T.; Kelokaski, M.; Siitari-Kauppi, M. [Laboratory of Radiochemistry, University of Helsinki, P.O.Box 55, University of Helsinki, FIN- 00014 (Finland); Voutilainen, M.; Myllys, M.; Turpeinen, T.; Timonen, J. [Department of Physics, University of Jyvaeskylae, P.O.Box 35, Jyvaeskylae, FIN-40351 (Finland); Mateos, F.; Montoto, M. [Department of Geology, University of Oviedo, Oviedo, 33005 (Spain)

    2007-07-01T23:59:59.000Z

    First results of combining X-ray micro-computed tomography ({mu}CT), confocal laser-scanning microscopy (CLSM) and {sup 14}C-poly-methyl-methacrylate ({sup 14}C-PMMA) impregnation techniques in the study of granitic rock samples are reported. Combining results of {mu}CT and CLSM with those of the {sup 14}C-PMMA technique, the mineral-specific porosity and morphology of the open pore space, as well as its connectivity, could be analyzed from a micrometer up to a decimeter scale. Three different types of granite were studied. In two cases part of the micro-fissure and pore apertures were found to be in a micrometer scale, but in one case all grain-boundary openings were below the detection limit. Micrometer-scale apertures could be analyzed by CLSM and {mu}CT. The benefit of {mu}CT is that it can also provide the heterogeneous distribution of minerals in 3D. The 2D porosity distributions in the mineral phases, consisting of nanometer-scale pores, could be measured by the {sup 14}C-PMMA method together with the micro-fissures. This method does not, however, give the exact pore apertures. The limitations and applicability of the methods are discussed. (authors)

  2. Dielectric microscopy with submillimeter resolution

    E-Print Network [OSTI]

    Nathan S. Greeney; John A. Scales

    2007-06-20T23:59:59.000Z

    In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying dielectric properties of materials with sub-wavelength resolution; using a 150 GHz probe in transmision mode we see spatial resolution of around 500 microns. We have applied this method to a variety of highly heterogeneous materials. Here we show dielectric maps of granite and oil shale.

  3. Scanning electron microscopy of intestinal villous structures

    E-Print Network [OSTI]

    Boyer, Edmond

    briefly in running water for 30 minutes and were dehydrated through graded ethanol series (1 hour each in 50, 70, 80, 95 and 100 %). Dehydrated specimens were dried in a carbon dioxide critical point drier to avoid exposure of the specimens to any surface tension forces when drying. The dried specimens were

  4. Image Resolution in Scanning Transmission Electron Microscopy

    SciTech Connect (OSTI)

    Pennycook, S. J.; Lupini, A.R.

    2008-06-26T23:59:59.000Z

    Digital images captured with electron microscopes are corrupted by two fundamental effects: shot noise resulting from electron counting statistics and blur resulting from the nonzero width of the focused electron beam. The generic problem of computationally undoing these effects is called image reconstruction and for decades has proved to be one of the most challenging and important problems in imaging science. This proposal concerned the application of the Pixon method, the highest-performance image-reconstruction algorithm yet devised, to the enhancement of images obtained from the highest-resolution electron microscopes in the world, now in operation at Oak Ridge National Laboratory.

  5. A new Scanning Transmission X-ray Microscope at the ALS for operation up to 2500eV

    E-Print Network [OSTI]

    Kilcoyne, David

    2010-01-01T23:59:59.000Z

    and y interferometers (z is optional) sample scanning stackzone plate scanning stack FIGURE 6 Layout of functionalMagnet Beam Line for Scanning Transmission X-ray Microscopy

  6. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with...

  7. Proximal Probes | Center for Functional Nanomaterials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    and catalysis at pressures from ultrahigh vacuum (UHV) to 5 bar via complementary scanning tunneling microscopy imaging and photoelectron spectroscopy, coupled with real-time...

  8. Microscopy | EMSL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    By Atom Probe Tomography. 14YWT oxide dispersion strengthened (ODS) ferritic steel was irradiated with of 5 MeV Ni2+ ions, at 300 °C, 450 °C, and 600 °......

  9. Scanning optical microscope with long working distance objective

    DOE Patents [OSTI]

    Cloutier, Sylvain G. (Newark, DE)

    2010-10-19T23:59:59.000Z

    A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.

  10. Serial and parallel Si, Ge, and SiGe direct-write with scanning...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Serial and parallel Si, Ge, and SiGe direct-write with scanning probes and conducting stamps. Serial and parallel Si, Ge, and SiGe direct-write with scanning probes and conducting...

  11. Sub-microsecond-resolution probe microscopy

    DOE Patents [OSTI]

    Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

    2014-04-01T23:59:59.000Z

    Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

  12. Microscopy image segmentation tool: Robust image data analysis

    SciTech Connect (OSTI)

    Valmianski, Ilya, E-mail: ivalmian@ucsd.edu; Monton, Carlos; Schuller, Ivan K. [Department of Physics and Center for Advanced Nanoscience, University of California San Diego, 9500 Gilman Drive, La Jolla, California 92093 (United States)] [Department of Physics and Center for Advanced Nanoscience, University of California San Diego, 9500 Gilman Drive, La Jolla, California 92093 (United States)

    2014-03-15T23:59:59.000Z

    We present a software package called Microscopy Image Segmentation Tool (MIST). MIST is designed for analysis of microscopy images which contain large collections of small regions of interest (ROIs). Originally developed for analysis of porous anodic alumina scanning electron images, MIST capabilities have been expanded to allow use in a large variety of problems including analysis of biological tissue, inorganic and organic film grain structure, as well as nano- and meso-scopic structures. MIST provides a robust segmentation algorithm for the ROIs, includes many useful analysis capabilities, and is highly flexible allowing incorporation of specialized user developed analysis. We describe the unique advantages MIST has over existing analysis software. In addition, we present a number of diverse applications to scanning electron microscopy, atomic force microscopy, magnetic force microscopy, scanning tunneling microscopy, and fluorescent confocal laser scanning microscopy.

  13. Scanned probe characterization of semiconductor nanostructures

    E-Print Network [OSTI]

    Law, James Jeremy MacDonald

    2009-01-01T23:59:59.000Z

    is cancelled out and the voltage oscillation ceases. Thisthe sample, this ac voltage causes a mechanical oscillation.voltage to the tip through a feedback loop, the mechanical oscillations

  14. Scanned probe characterization of semiconductor nanostructures

    E-Print Network [OSTI]

    Law, James Jeremy MacDonald

    2009-01-01T23:59:59.000Z

    mismatch between GaN and the growth substrate and arepreferred substrate for growth of GaN and related materials.involved in growing GaN on a sapphire substrate necessitate

  15. Optical 2-D Scanning System for Laser - Generated Shockwave Treatment of Wound Infections

    E-Print Network [OSTI]

    Patel, Shahzad Neville

    2013-01-01T23:59:59.000Z

    biofilm structure from confocal scanning laser microscopyAngeles Optical 2-D Scanning System for Laser - GeneratedTHE THESIS Optical 2-D Scanning System for Laser-Generated

  16. Optical Microscopy and 4Optical Microscopy and 4 Pi MicroscopyPi Microscopy

    E-Print Network [OSTI]

    La Rosa, Andres H.

    Optical Microscopy and 4Optical Microscopy and 4 Pi MicroscopyPi Microscopy Carolyn A. SuttonCarolyn A. Sutton PH 464PH 464 #12;OverviewOverview The OpticalThe Optical MicroscopeMicroscopy 4 Pi Microscopy4 Pi Microscopy Optical Microscope for Metallography #12;Optical Microscope: OriginsOptical

  17. High-throughput scanning confocal microscope for single molecule Chandran R. Sabanayagam, John S. Eid, and Amit Mellera)

    E-Print Network [OSTI]

    Meller, Amit

    High-throughput scanning confocal microscope for single molecule analysis Chandran R. Sabanayagam and probing of single molecules, and an automatic focusing feature that enables the unattended scanning

  18. Electron Microscopy Center

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Argonne Home > EMC > EMC Home Electron Microscopy Center Web Site has moved This page has moved to http:www.anl.govcnmgroupelectron-microscopy-cente...

  19. Probing the Degradation Mechanisms in Electrolyte Solutions for...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Degradation Mechanisms in Electrolyte Solutions for Li-ion Batteries by In-Situ Transmission Electron Microscopy. Probing the Degradation Mechanisms in Electrolyte Solutions for...

  20. atom probe study: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    using both APT and correlative microscopy techniques, a more complete understanding... Bennett, Samantha 2011-02-08 2 ATOM-PROBE TOMOGRAPHIC STUDY OF THE THREE-DIMENSIONAL...

  1. Variable-ambient scanning stage for a laser scanning confocal microscope D. J. Sirbuly, J. P. Schmidt, M. D. Mason, M. A. Summers, and S. K. Burattoa)

    E-Print Network [OSTI]

    Buratto, Steve

    Variable-ambient scanning stage for a laser scanning confocal microscope D. J. Sirbuly, J. P A variable-ambient scanning stage for a laser scanning confocal microscope was designed and tested. The stage attempts to remove deleterious species such as oxygen in laser scanning confocal microscopy experiments

  2. Free motion scanning system

    DOE Patents [OSTI]

    Sword, Charles K. (Pleasant Hills, PA)

    2000-01-01T23:59:59.000Z

    The present invention relates to an ultrasonic scanner system and method for the imaging of a part system, the scanner comprising: a probe assembly spaced apart from the surface of the part including at least two tracking signals for emitting radiation and a transmitter for emitting ultrasonic waves onto a surface in order to induce at least a portion of the waves to be reflected from the part, at least one detector for receiving the radiation wherein the detector is positioned to receive the radiation from the tracking signals, an analyzer for recognizing a three-dimensional location of the tracking signals based on the emitted radiation, a differential converter for generating an output signal representative of the waveform of the reflected waves, and a device such as a computer for relating said tracking signal location with the output signal and projecting an image of the resulting data. The scanner and method are particularly useful to acquire ultrasonic inspection data by scanning the probe over a complex part surface in an arbitrary scanning pattern.

  3. Spectrophotometric probe

    DOE Patents [OSTI]

    Prather, William S. (Augusta, GA); O'Rourke, Patrick E. (Martinez, GA)

    1994-01-01T23:59:59.000Z

    A support structure bearing at least one probe for making spectrophotometric measurements of a fluid using a source of light and a spectrophotometer. The probe includes a housing with two optical fibers and a planoconvex lens. A sleeve bearing a mirror surrounds the housing. The lens is separated from the mirror by a fixed distance, defining an interior space for receiving a volume of the fluid sample. A plurality of throughholes extending through the sleeve communicate between the sample volume and the exterior of the probe, all but one hole bearing a screen. A protective jacket surrounds the probe. A hollow conduit bearing a tube is formed in the wall of the probe for venting any air in the interior space when fluid enters. The probe is held at an acute angle so the optic fibers carrying the light to and from the probe are not bent severely on emergence from the probe.

  4. Spectrophotometric probe

    DOE Patents [OSTI]

    Prather, W.S.; O'Rourke, P.E.

    1994-08-02T23:59:59.000Z

    A support structure is described bearing at least one probe for making spectrophotometric measurements of a fluid using a source of light and a spectrophotometer. The probe includes a housing with two optical fibers and a planoconvex lens. A sleeve bearing a mirror surrounds the housing. The lens is separated from the mirror by a fixed distance, defining an interior space for receiving a volume of the fluid sample. A plurality of throughholes extending through the sleeve communicate between the sample volume and the exterior of the probe, all but one hole bearing a screen. A protective jacket surrounds the probe. A hollow conduit bearing a tube is formed in the wall of the probe for venting any air in the interior space when fluid enters. The probe is held at an acute angle so the optic fibers carrying the light to and from the probe are not bent severely on emergence from the probe. 3 figs.

  5. Fiber delivered probe for efficient CARS imaging of tissues

    E-Print Network [OSTI]

    Balu, Mihaela; Liu, Gangjun; Chen, Zhongping; Tromberg, Bruce J; Potma, Eric O

    2010-01-01T23:59:59.000Z

    probe based on microelectromechanical system mirror forbased on a microelectromechanical systems scanning mirror,”based on a microelectromechanical systems two-dimensional

  6. IIII--E. Scanning Probe LithographyE. Scanning Probe Lithography Voltage pulse

    E-Print Network [OSTI]

    Liu, Kai

    Molnar, PRB 57 14028 (1998) Lithography Liu, UCD Phy250-1, 2011, NanoFab34 Contamination PRB 57 14028 GrowthStep Growth--66 Annealed NaCl substrates Sugawara & Scheinfein, PRB 56, 8499 (1997). Lithography

  7. 370 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, VOL. 10, NO. 3, SEPTEMBER 2001 Design and Batch Fabrication of Probes for

    E-Print Network [OSTI]

    Shi, Li

    for scanning thermal microscopy (SThM) with spatial resolution in the sub-100 nm range. A heat transfer model

  8. FSU Property Scanning Procedures To Scan Barcodes

    E-Print Network [OSTI]

    McQuade, D. Tyler

    1 of 3 FSU Property Scanning Procedures To Scan Barcodes: 1) To power up the scanner BLUE=CONTINUE ESC=DONE 4) Press the yellow button to scan your FSU location tag. When the location tag has been successfully scanned you will hear a beep and the display will look like this: ITEM

  9. Demonstration of Ballistic Electron Emission Microscopy / Spectroscopy on the Au/Si (001) system

    E-Print Network [OSTI]

    Drummond, Mary Alyssa

    1997-01-01T23:59:59.000Z

    The Ballistic Electron Emission Microscopy (BEEM) capabilities of a Scanning Tunneling Microscope (STM) have been verified. BEEM is used to analyze the characteristics of buried energy barriers and was developed as an extension of scanning tunneling...

  10. annular dark-field scanning: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Websites Summary: field scanning transmission electron microscopy (HAADF-STEM), STEM-energy-dispersive X-ray spectrometry nanoparticles. The image contrast in HAADF-STEM is...

  11. 1996, Journal of Microscopy 181, 225-237 (and vol 182, p 240.) Multimodal microscopy by digital image processing

    E-Print Network [OSTI]

    Stone, J. V.

    , Blakistone and Kyryk 1990 compared applications of polarised light, bright eld, DIC and scanning electron microscopy SEM in the paper industry. Fluorescence microscopy adds further possible imaging modes to light. 1 #12;1 Introduction Di erent imaging modes with the light microscope convey complementary infor

  12. Application of High-Angle Annular Dark Field Scanning Transmission

    E-Print Network [OSTI]

    Utsunomiya, Satoshi

    Transmission Electron Microscopy-Energy Dispersive X-ray Spectrometry, and Energy-Filtered Transmission field scanning transmission electron microscopy (HAADF-STEM), STEM-energy-dispersive X-ray spectrometry). Techniquesthatareusefulinanalyzingultrafineatmospheric particles, such as STEM, EELS (electron energy loss spec- trometry), AFM, and mass spectrometry

  13. Scanning Tunneling Microscopy currents on locally disordered graphene

    E-Print Network [OSTI]

    Tsai, Shan-Wen; Peres, Nuno M. R.; Santos, J. E.; Ribeiro, R. M.

    2009-01-01T23:59:59.000Z

    Intrinsic ripples in graphene“, Nature Materials 6, 858 (Novoselov, ”Control of graphene’s properties by reversiblespectroscopy of monolayer graphene on SiO 2 ”, arXiv:

  14. Surface Science Letters Scanning tunneling microscopy of gold clusters on

    E-Print Network [OSTI]

    Goodman, Wayne

    ; Catalysis There are many fundamental and applied reasons for studying the stability of deposited junctions and active elements. In catalysis, deactivation of the active metal component is di- rectly

  15. Scanning Transmission Electron Microscopy Investigations of Complex Oxides

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOE Office of ScienceandMesa del Sol HomeFacebook Twitter Principal InvestigatorsSave Energy onofCNMS, SNS launch|

  16. Multifocal Multiphoton Laser-Scanning Structured Illumination Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOEThe Bonneville PowerCherries 82981-1cnHighandSWPA / SPRA /Ml'.SolarUS Dept ofActingMultidimensionalwith

  17. Scanning the Conservation Horizon

    E-Print Network [OSTI]

    Scanning the Conservation Horizon A Guide to Climate Change Vulnerability Assessment #12;Scanning.A. Stein, and N.A. Edelson, editors. 2011. Scanning the Conservation Horizon: A Guide to Climate Change.S. Geological Survey Fundamental Science Practices. Scanning the Conservation Horizon is available online at

  18. Preparation of TiO2(110)-(1x1) Surface via UHV Cleavage: An scanning...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Preparation of TiO2(110)-(1x1) Surface via UHV Cleavage: An scanning tunneling microscopy study. Preparation of TiO2(110)-(1x1) Surface via UHV Cleavage: An scanning tunneling...

  19. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong (Alameda, CA); Gao, Chen (Anhui, CN); Schultz, Peter G. (La Jolla, CA); Wei, Tao (Sunnyvale, CA)

    2003-01-01T23:59:59.000Z

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  20. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong (Alameda, CA); Gao, Chen (Alameda, CA)

    2001-01-01T23:59:59.000Z

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  1. 350-?m side-view optical probe for imaging the murine brain in vivo from the cortex to the hypothalamus

    E-Print Network [OSTI]

    Kim, Jun Ki

    Miniature endoscopic probes offer a solution for deep brain imaging by overcoming the limited depth of intravital microscopy. We describe a small-diameter (350 ?m) graded-index optical probe with a side-view design for in ...

  2. Scanning Optical Mosaic Scope for Micro-Manipulation Benjamin Potsaid, Yves Bellouard, John T. Wen

    E-Print Network [OSTI]

    Wen, John Ting-Yung

    Scanning Optical Mosaic Scope for Micro-Manipulation Benjamin Potsaid, Yves Bellouard, John T. Wen microscopy, which we call scanning optical mosaic scope (SOMS), that addresses the limitation of the field of vision. The key idea is to use high-speed scanners and a high- speed camera to scan the workspace

  3. Integrated micro-scanning tunneling microscope Y. Xu and N. C. MacDonald

    E-Print Network [OSTI]

    MacDonald, Noel C.

    Integrated micro-scanning tunneling microscope Y. Xu and N. C. MacDonald School of Electrical of micro-scanning tunneling microscopes micro-STMs have been fabricated. The integrated micro metal conductor on a silicon chip. © 1995 American Institute of Physics. Scanned-probe instruments have

  4. A versatile scanning acoustic platform

    E-Print Network [OSTI]

    N G Parker; P V Nelson; M J W Povey

    2010-02-01T23:59:59.000Z

    We present a versatile and highly configurable scanning acoustic platform. This platform, comprising of a high frequency transducer, bespoke positioning system and temperature-regulated sample unit, enables the acoustic probing of materials over a wide range of length scales and with minimal thermal aberration. In its bare form the platform acts as a reflection-mode acoustic microscope, while optical capabilities are readily incorporated to extend its abilities to the acousto-optic domain. Here we illustrate the capabilities of the platform through its incarnation as an acoustic microscope. Operating at 55 MHz we demonstrate acoustic imaging with a lateral resolution of 25 microns. We outline its construction, calibration and capabilities as an acoustic microscope, and discuss its wider applications.

  5. The Application of Fluorescence Lifetime Imaging Microscopy to Quantitatively Map Mixing and Temperature in Microfluidic Systems 

    E-Print Network [OSTI]

    Graham, Emmelyn M

    2008-01-01T23:59:59.000Z

    The technique of Fluorescence Lifetime Imaging Microscopy (FLIM) has been employed to quantitatively and spatially map the fluid composition and temperature within microfluidic systems. A molecular probe with a ...

  6. Fiber optic probe of free electron evanescent fields in the optical frequency range

    SciTech Connect (OSTI)

    So, Jin-Kyu, E-mail: js1m10@orc.soton.ac.uk; MacDonald, Kevin F. [Optoelectronics Research Centre and Centre for Photonic Metamaterials, University of Southampton, Highfield, Southampton SO17 1BJ (United Kingdom); Zheludev, Nikolay I. [Optoelectronics Research Centre and Centre for Photonic Metamaterials, University of Southampton, Highfield, Southampton SO17 1BJ (United Kingdom); Centre for Disruptive Photonic Technologies, Nanyang Technological University, Singapore 637371 (Singapore)

    2014-05-19T23:59:59.000Z

    We introduce an optical fiber platform which can be used to interrogate proximity interactions between free-electron evanescent fields and photonic nanostructures at optical frequencies in a manner similar to that in which optical evanescent fields are sampled using nanoscale aperture probes in scanning near-field microscopy. Conically profiled optical fiber tips functionalized with nano-gratings are employed to couple electron evanescent fields to light via the Smith-Purcell effect. We demonstrate the interrogation of medium energy (30–50?keV) electron fields with a lateral resolution of a few micrometers via the generation and detection of visible/UV radiation in the 700–300?nm (free-space) wavelength range.

  7. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2013-01-22T23:59:59.000Z

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  8. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong (Danville, CA); Gao, Chen (Anhui, CN); Duewer, Fred (Albany, CA); Yang, Hai Tao (Albany, CA); Lu, Yalin (Chelmsford, MA)

    2009-06-23T23:59:59.000Z

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  9. Computational microscopy for sample analysis

    E-Print Network [OSTI]

    Ikoma, Hayato

    2014-01-01T23:59:59.000Z

    Computational microscopy is an emerging technology which extends the capabilities of optical microscopy with the help of computation. One of the notable example is super resolution fluorescence microscopy which achieves ...

  10. Nanoscale Probing of Voltage Activated Oxygen Reduction/Evolution Reactions in Nanopatterned (LaxSr1-x)CoO3- Cathodes

    SciTech Connect (OSTI)

    Leonard, Donovan N [ORNL; Kumar, Amit [ORNL; Jesse, Stephen [ORNL; Biegalski, Michael D [ORNL; Christen, Hans M [ORNL; Mutoro, Eva [Massachusetts Institute of Technology (MIT); Crumlin, Ethan [Massachusetts Institute of Technology (MIT); Shao-Horn, Yang [Massachusetts Institute of Technology (MIT); Kalinin, Sergei V [ORNL; Borisevich, Albina Y [ORNL

    2013-01-01T23:59:59.000Z

    Bias-dependent mechanisms of reversible and irreversible electrochemical processes on a (La0.5Sr0.5)2CoO4 modified (LaxSr1-x)CoO3- surface are studied using dynamic electrochemical strain microscopy (D-ESM). The reversible oxygen reduction/evolution process is activated at voltages as low as 3 4 V and the degree of transformation increases linearly with applied bias. The irreversible processes associated with static surface deformation become apparent above 10 12 V. Post-mortem focused-ion milling combined with atomic resolution scanning transmission electron microscopy and electron energy loss spectroscopy is used to establish the mechanisms of irreversible transformations and attribute it to amorphization of the top layer of material. These studies both establish the framework for probing irreversible electrochemical processes in solids and illustrate rich spectrum of electrochemical transformations underpinning electrocatalytic activity in cobaltites.

  11. An investigation of receiver probe development for magnetic resonance microscopy

    E-Print Network [OSTI]

    Boyer, Jeffrey Scott

    1995-01-01T23:59:59.000Z

    planar microcoils and microcoil array designs are given that can be rearranged using integrated circuit and printed circuit board fabrication techniques....

  12. Topics for letter "s" | EMSL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Development Lab Quiet Wing RadEMSL Virtual Tour Topics for letter "s" samples scale scanning scanning electron microscope scanning probe scanning tunneling microscopy...

  13. Development of Micromachined Probes for Bio-Nano Applications

    E-Print Network [OSTI]

    Yapici, Murat K.

    2010-01-14T23:59:59.000Z

    . A scanning electron micrograph showing the existence of a wear scar on the scanning probe tip after writing. ........................................ 51 Figure 32. Computer images reconstructed from AFM measurement results showing the formation...? tips. .......................................................................................... 56 xi Page Figure 35. An illustration of the controllable process for the formation of variable sized cavities based on bulk micromachining of an SOI...

  14. Vulnerability Scanning Policy 1 Introduction

    E-Print Network [OSTI]

    Vulnerability Scanning Policy 1 Introduction Vulnerability scanning is an important and necessary and can alert system administrators to potentially serious problems. However vulnerability scanning also to compromise system security. The following policy details the conditions under which vulnerability scans may

  15. Integrated Optical Probes

    SciTech Connect (OSTI)

    Brent Frogget, Douglas DeVore, Vincent Romero, David Esquibel, and David Holtkamp

    2008-09-04T23:59:59.000Z

    Optical probes used in velocimetry measurements have typically been individual probes that collect data for a single diagnostic at a single point. These probes have been used in diagnostics such as VISAR, PDV, and radiometry, which measure surface velocity, temperature, and other characteristics. When separate probes are used for these measurements, the different diagnostic points measured must be significantly separated. We have developed integrated probes that collect data for multiple optical diagnostics; these probes measure points in close proximity.

  16. Nonlinear vibrational microscopy

    DOE Patents [OSTI]

    Holtom, Gary R. (Richland, WA); Xie, Xiaoliang Sunney (Richland, WA); Zumbusch, Andreas (Munchen, DE)

    2000-01-01T23:59:59.000Z

    The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. Microscopic imaging with a vibrational spectroscopic contrast is achieved by generating signals in a nonlinear optical process and spatially resolved detection of the signals. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a. directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b. collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c. removing the residual beam; and d. detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution then IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers. CARS and SFG microscopy does not rely on the presence of fluorophores, but retains the resolution and three-dimensional sectioning capability of confocal and two-photon fluorescence microscopy. Complementary to these techniques, CARS and SFG microscopy provides a contrast mechanism based on vibrational spectroscopy. This vibrational contrast mechanism, combined with an unprecedented high sensitivity at a tolerable laser power level, provides a new approach for microscopic investigations of chemical and biological samples.

  17. Hydrodynamic ultrasonic probe

    DOE Patents [OSTI]

    Day, Robert A. (Livermore, CA); Conti, Armond E. (San Jose, CA)

    1980-01-01T23:59:59.000Z

    An improved probe for in-service ultrasonic inspection of long lengths of a workpiece, such as small diameter tubing from the interior. The improved probe utilizes a conventional transducer or transducers configured to inspect the tubing for flaws and/or wall thickness variations. The probe utilizes a hydraulic technique, in place of the conventional mechanical guides or bushings, which allows the probe to move rectilinearly or rotationally while preventing cocking thereof in the tube and provides damping vibration of the probe. The probe thus has lower friction and higher inspection speed than presently known probes.

  18. Cryogenic scanning Hall-probe microscope with centimeter scan range and submicron resolution

    E-Print Network [OSTI]

    Moler, Kathryn A.

    with 200 nm positioning resolution by coupling stepper motors to high-resolution drivers and reducing gears in coated conductors--high-Tc superconducting tapes--is demonstrated via model systems. We image an entire also use motor-driven microme- ters but couple them to improved electronics and reducing gears

  19. 3D rotational diffusion microrheology using 2D video microscopy

    E-Print Network [OSTI]

    Rémy Colin; Minhao Yan; Loudjy Chevry; Jean-François Berret; Bérengère Abou

    2012-01-05T23:59:59.000Z

    We propose a simple way to perform three-dimensional (3D) rotational microrheology using two-dimensional (2D) video microscopy. The 3D rotational brownian motion of micrometric wires in a viscous fluid is deduced from their projection on the focal plane of an optical microscope objective. The rotational diffusion coefficient of the wires of length between 1-100 \\mu m is extracted, as well as their diameter distribution in good agreement with electron microscopy measurements. This is a promising way to characterize soft visco-elastic materials, and probe the dimensions of anisotropic objects.

  20. Appendix 3 Document Scanning Guidelines Appendix 3 Document Scanning Guidelines

    E-Print Network [OSTI]

    Tsien, Roger Y.

    Appendix 3 Document Scanning Guidelines App.3-1 Appendix 3 ­ Document Scanning Guidelines 1. Turn. Note: Whenever possible, it is best to convert a Word document into a PDF than to scan a document and convert it to a PDF. A Word document that has been converted is searchable; a scanned document is not. 2

  1. Vector generator scan converter

    DOE Patents [OSTI]

    Moore, James M. (Livermore, CA); Leighton, James F. (Livermore, CA)

    1990-01-01T23:59:59.000Z

    High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O (input/output) channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardward for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold.

  2. Vector generator scan converter

    DOE Patents [OSTI]

    Moore, J.M.; Leighton, J.F.

    1988-02-05T23:59:59.000Z

    High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardware for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold. 7 figs.

  3. Atom probe tomography studies of Al?O? gate dielectrics on GaN

    SciTech Connect (OSTI)

    Mazumder, Baishakhi, E-mail: bmazumder@engineering.ucsb.edu; Wu, Feng; Speck, James S. [Materials Department, University of California, Santa Barbara, California 93106 (United States); Liu, Xiang; Yeluri, Ramya; Mishra, Umesh K. [Electrical and Computer Engineering Department, University of California, Santa Barbara, California 93106 (United States)

    2014-10-07T23:59:59.000Z

    Atom probe tomography was used to achieve three-dimensional characterization of in situ Al?O?/GaN structures grown by metal organic chemical vapor deposition (MOCVD). Al?O? dielectrics grown at three different temperatures of 700, 900, and 1000 °C were analyzed and compared. A low temperature GaN cap layer grown atop Al?O? enabled a high success rate in the atom probe experiments. The Al?O?/GaN interfaces were found to be intermixed with Ga, N, and O over the distance of a few nm. Impurity measurements data showed that the 1000 °C sample contains higher amounts of C (4 × 10¹?/cm³) and lower amounts of H (7 × 10¹?/cm³), whereas the 700 °C sample exhibits lower C impurities (<10¹?/cm³) and higher H incorporation (2.2 × 10²?/cm³). On comparing with Al?O? grown by atomic layer deposition (ALD), it was found that the MOCVD Al?O?/GaN interface is comparatively abrupt. Scanning transmission electron microscopy data showed that the 900 °C and 1000 °C MOCVD films exhibit polycrystalline nature, while the ALD films were found to be amorphous.

  4. Scanning computed confocal imager

    DOE Patents [OSTI]

    George, John S. (Los Alamos, NM)

    2000-03-14T23:59:59.000Z

    There is provided a confocal imager comprising a light source emitting a light, with a light modulator in optical communication with the light source for varying the spatial and temporal pattern of the light. A beam splitter receives the scanned light and direct the scanned light onto a target and pass light reflected from the target to a video capturing device for receiving the reflected light and transferring a digital image of the reflected light to a computer for creating a virtual aperture and outputting the digital image. In a transmissive mode of operation the invention omits the beam splitter means and captures light passed through the target.

  5. Characterization of Polymer Blends: Optical Microscopy (*Polarized, Interference and Phase Contrast Microscopy*) and Confocal Microscopy

    SciTech Connect (OSTI)

    Ramanathan, Nathan Muruganathan [ORNL; Darling, Seth B. [Argonne National Laboratory (ANL)

    2015-01-01T23:59:59.000Z

    Chapter 15 surveys the characterization of macro, micro and meso morphologies of polymer blends by optical microscopy. Confocal Microscopy offers the ability to view the three dimensional morphology of polymer blends, popular in characterization of biological systems. Confocal microscopy uses point illumination and a spatial pinhole to eliminate out-of focus light in samples that are thicker than the focal plane.

  6. Documentation and Scanning Tips NUFinancials

    E-Print Network [OSTI]

    Shull, Kenneth R.

    Documentation and Scanning Tips NUFinancials Documentation and Scanning Tips 2/6/2014 - RB © 2014 of a transaction (expense reports, online vouchers, journals, or requisitions) that has been scanned and attached. · All relevant backup documentation that is not scanned and attached to the transaction record should

  7. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Loganathan, Muthukumaran; Bristow, Douglas A., E-mail: dbristow@mst.edu [Department of Mechanical and Aerospace Engineering, Missouri University of Science and Technology, Rolla, Missouri 65401 (United States)

    2014-04-15T23:59:59.000Z

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  8. Scanning micro-sclerometer

    DOE Patents [OSTI]

    Oliver, Warren C. (Knoxville, TN); Blau, Peter J. (Oak Ridge, TN)

    1994-01-01T23:59:59.000Z

    A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch.

  9. Scanning micro-sclerometer

    DOE Patents [OSTI]

    Oliver, W.C.; Blau, P.J.

    1994-11-01T23:59:59.000Z

    A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch. 2 figs.

  10. Atom probe study of grain boundary segregation in technically pure molybdenum

    SciTech Connect (OSTI)

    Babinsky, K., E-mail: katharina.babinsky@stud.unileoben.ac.at [Montanuniversität Leoben, Department of Physical Metallurgy and Materials Testing, Franz-Josef Straße 18, 8700 Leoben (Austria); Weidow, J., E-mail: jonathan.weidow@chalmers.se [Chalmers University of Technology, Department of Applied Physics, 412 96 Gothenburg (Sweden); Knabl, W., E-mail: wolfram.knabl@plansee.com [PLANSEE SE, Metallwerk-Plansee-Straße 71, 6600 Reutte (Austria); Lorich, A., E-mail: alexander.lorich@plansee.com [PLANSEE SE, Metallwerk-Plansee-Straße 71, 6600 Reutte (Austria); Leitner, H., E-mail: harald.leitner@bohler-edelstahl.at [Montanuniversität Leoben, Department of Physical Metallurgy and Materials Testing, Franz-Josef Straße 18, 8700 Leoben (Austria); Primig, S., E-mail: sophie.primig@unileoben.ac.at [Montanuniversität Leoben, Department of Physical Metallurgy and Materials Testing, Franz-Josef Straße 18, 8700 Leoben (Austria)

    2014-01-15T23:59:59.000Z

    Molybdenum, a metal with excellent physical, chemical and high-temperature properties, is an interesting material for applications in lighting-technology, high performance electronics, high temperature furnace construction and coating technology. However, its applicability as a structural material is limited because of the poor oxidation resistance at high temperatures and a brittle-to-ductile transition around room temperature, which is influenced by the grain size and the content of interstitial impurities at the grain boundaries. Due to the progress of the powder metallurgical production during the last decades, the amount of impurities in the current quality of molybdenum has become so small that surface sensitive techniques are not applicable anymore. Therefore, the atom probe, which allows the detection of small amounts of impurities as well as their location, seems to be a more suitable technique. However, a site-specific specimen preparation procedure for grain boundaries in refractory metals with a dual focused ion beam/scanning electron microscope is still required. The present investigation describes the development and successful application of such a site-specific preparation technique for grain boundaries in molybdenum, which is significantly improved by a combination with transmission electron microscopy. This complimentary technique helps to improve the visibility of grain boundaries during the last preparation steps and to evidence the presence of grain and subgrain boundaries without segregants in atom probe specimens. Furthermore, in industrially processed and recrystallized molybdenum sheets grain boundary segregation of oxygen, nitrogen and potassium is successfully detected close to segregated regions which are believed to be former sinter pores. - Highlights: • First study of grain boundary segregation in molybdenum by atom probe • Site-specific preparation technique by FIB and TEM successfully developed • Grain boundary segregation of oxygen, nitrogen and potassium found • Segregation in former sinter-pores detected • Presence of grain boundaries without segregation evidenced.

  11. 4 K, ultrahigh vacuum scanning tunneling microscope having two orthogonal tips with tunnel junctions as close as a few nanometers

    E-Print Network [OSTI]

    Thibado, Paul M.

    with a scanning electron microscopy SEM , these two imaging methods nicely bridge the gap from mi- crons structure of semiconductor devices by interrupting the fabri- cation process.7­11 This has led

  12. Directional intraoperative probe

    DOE Patents [OSTI]

    Majewski, Stanislaw; Popov, Vladimir; Loutts, Georgii

    2003-11-04T23:59:59.000Z

    An introperative surgical probe incorporating both a fiber optic imaging system and multi-element beta/gamma radiation directional indicating system is described.

  13. Homodyne scanning holography Joseph Rosen*

    E-Print Network [OSTI]

    Rosen, Joseph

    Homodyne scanning holography Joseph Rosen* Department of Electrical and Computer Engineering, Ben developed a modified version of a scanning holography microscope in which the Fresnel Zone Plates (FZP) are created by a homodyne rather than a heterodyne interferometer. Therefore, during the scanning

  14. ARM Scanning Radar

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOE Office511041cloth DocumentationProducts (VAP) VAP Update Information on new,Scanning Radar Azores Graciosa

  15. Synchronisation in Scan-On-Scan-On-Scan I. Vaughan L. Clarkson

    E-Print Network [OSTI]

    Clarkson, Vaughan

    strategy. I. INTRODUCTION Electronic Support (ES) is that area of Electronic Warfare (EW) concerned-on-scan-on-scan' problem, important in Electronic Support. In this paper, the theory of three-way and higher

  16. Evaluation of thermal evaporation conditions used in coating aluminum on near-field fiber-optic probes

    E-Print Network [OSTI]

    Hollars, Christopher W.; Dunn, Robert C.

    1998-01-01T23:59:59.000Z

    The effects that the thermal evaporation conditions have on the roughness of aluminum-coated near-field fiber-optic probes were investigated using the high-resolution capabilities of atomic force microscopy. The coating ...

  17. Scanning Microscopy, Vol. 5, No. 2, 1991 (Pages 317-328) Scanning Microscopy International, Chicago (AMF O'Hare), IL 60666 USA

    E-Print Network [OSTI]

    Vertes, Akos

    (AMF O'Hare), IL 60666 USA 0891-7035/91$3.00+.00 RESTRICTED ENERGY TRANSFER IN LASER DESORPTION OF HIGH- guished importance in mass spectrometry. In our present study we survey different laser desorption methods of restricted energy transfer pathways as a pos- sible explanation to the volatilization of non-degraded large

  18. Band Offsets of InGaP/GaAs Heterojunctions by Scanning Tunneling Spectroscopy Y. Dong and R. M. Feenstra

    E-Print Network [OSTI]

    Feenstra, Randall

    1 Band Offsets of InGaP/GaAs Heterojunctions by Scanning Tunneling Spectroscopy Y. Dong and R. M Abstract Scanning tunneling microscopy and spectroscopy are used to study InGaP/GaAs heterojunctions computation of the tunnel current. Curve fitting of theory to experiment is performed. Using an InGaP band gap

  19. Carbon nanotube based electromechanical probes

    E-Print Network [OSTI]

    Yaglioglu, Onnik, 1976-

    2007-01-01T23:59:59.000Z

    Electromechanical probing applications continuously require smaller pitches, faster manufacturing and lower electrical resistance. Conventional techniques, such as MEMS based cantilever probes have their shortcomings in ...

  20. Chemical sensing flow probe

    DOE Patents [OSTI]

    Laguna, George R. (Albuquerque, NM); Peter, Frank J. (Albuquerque, NM); Butler, Michael A. (Albuquerque, NM)

    1999-01-01T23:59:59.000Z

    A new chemical probe determines the properties of an analyte using the light absorption of the products of a reagent/analyte reaction. The probe places a small reaction volume in contact with a large analyte volume. Analyte diffuses into the reaction volume. Reagent is selectively supplied to the reaction volume. The light absorption of the reaction in the reaction volume indicates properties of the original analyte. The probe is suitable for repeated use in remote or hostile environments. It does not require physical sampling of the analyte or result in significant regent contamination of the analyte reservoir.

  1. Focus: DNA probes

    SciTech Connect (OSTI)

    Not Available

    1986-11-01T23:59:59.000Z

    Progress in the development of DNA probes for the identification and quantitation of specific genetic sequences in biological samples is reviewed. Current research efforts in the development of DNA probes for the diagnosis of a wide variety of bacterial, viral, and other infectious diseases, such as herpes simplex and cytomegalovirus, and inherited genetic diseases such as cystic fibrosis and sickle cell anemia are discussed. Progress in development of DNA probe assays for cancer diagnosis, detection of Salmonella food poisoning, tissue typing (detection of histocompatibility antigens), mutagen screening, and animal diseases, among other applications is included.

  2. FEATURE ARTICLE Coherent Anti-Stokes Raman Scattering Microscopy: Instrumentation, Theory, and

    E-Print Network [OSTI]

    Xie, Xiaoliang Sunney

    probes fast diffusion dynamics with vibrational selectivity. 1. Introduction Investigation of molecular-photon fluorescence microscopy a useful tool for in vivo imaging. Chemical imaging by use of inherent molecular is, however, limited by the long excitation wavelength (several micrometers) and the IR absorption

  3. Reproducible strain measurement in electronic devices by applying integer multiple to scanning grating in scanning moiré fringe imaging

    SciTech Connect (OSTI)

    Kim, Suhyun, E-mail: u98kim@surface.phys.titech.ac.jp; Jung, Younheum; Kim, Joong Jung; Lee, Sunyoung; Lee, Haebum [Memory Analysis Science and Engineering Group, Samsung Electronics, San #16 Hwasung-city, Gyeonggi-Do 445-701 (Korea, Republic of); Kondo, Yukihito [EM Business Unit, JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558 (Japan)

    2014-10-15T23:59:59.000Z

    Scanning moiré fringe (SMF) imaging by high-angle annular dark field scanning transmission electron microscopy was used to measure the strain field in the channel of a transistor with a CoSi{sub 2} source and drain. Nanometer-scale SMFs were formed with a scanning grating size of d{sub s} at integer multiples of the Si crystal lattice spacing d{sub l} (d{sub s} ? nd{sub l}, n = 2, 3, 4, 5). The moiré fringe formula was modified to establish a method for quantifying strain measurement. We showed that strain fields in a transistor measured by SMF images were reproducible with an accuracy of 0.02%.

  4. Continuous scanning mode for ptychography

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Clark, Jesse N.; Huang, Xiaojing; Harder, Ross J.; Robinson, Ian K.

    2014-01-01T23:59:59.000Z

    We outline how ptychographic imaging can be performed without the need for discrete scan positions. Through an idealized experiment, we demonstrate how a discrete-position scan regime can be replaced with a continuously scanned one with suitable modification of the reconstruction scheme based on coherent modes. The impact of this is that acquisition times can be reduced, significantly aiding ptychographic imaging with x rays, electrons, or visible light.

  5. Analytical electron microscopy characterization of uranium-contaminated soils from the Fernald Site, FY1993 report

    SciTech Connect (OSTI)

    Buck, E.C.; Cunnane, J.C.; Brown, N.R.; Dietz, N.L.

    1994-10-01T23:59:59.000Z

    A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM) is being used to determine the nature of uranium in soils from the Fernald Environmental Management Project. The information gained from these studies is being used to develop and test remediation technologies. Investigations using SEM have shown that uranium is contained within particles that are typically 1 to 100 {mu}m in diameter. Further analysis with AEM has shown that these uranium-rich regions are made up of discrete uranium-bearing phases. The distribution of these uranium phases was found to be inhomogeneous at the microscopic level.

  6. ORNL microscopy directly images problematic lithium dendrites...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    865.574.7308 ORNL microscopy directly images problematic lithium dendrites in batteries ORNL electron microscopy captured the first real-time nanoscale images of the nucleation and...

  7. Center for Nanophase Materials Sciences | ORNL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    in nanostructured materials. Fieldstechniques include scanning probe microscopy, neutron scattering, optical spectroscopy and soft-matter electron and helium ion...

  8. Igor Lyubinetsky | EMSL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    reactivity Igor Lyubinetsky, EMSL, and Michael Henderson, PNNL, show how scanning probe microscopy provides scientists with detailed molecular information on...

  9. Small ASM probes

    SciTech Connect (OSTI)

    Fritz, J.N.; Olinger, B.; Vorthman, J.E.; Wilder, L.

    1988-10-01T23:59:59.000Z

    A part of the ongoing effort to miniaturize the adjoint sensitivity method (ASM) probe, six small probes in different configurations were tested on a single experiment. The results of the different configurations are presented. The ASM probe is quite accurate and its performance is well understood in those situations where we have a relatively large area that has 1-D flow. Area is expensive and it is desirable to make measurements using a minimum of this resource. When we confine ourselves to a small area we get electromagnetic effects and perturbations in the hydrodynamic flows that were absent in experiments whose lateral extent was large enough to effectively eliminate these problems. We are forced toward magnet and coil configurations that are not ideal for best accuracy. In the experiment described in this report, we describe and report the results of six ASM probes that approach the goal of using less area. 2 refs., 23 figs., 2 tabs.

  10. Entanglement-assisted electron microscopy based on a flux qubit

    SciTech Connect (OSTI)

    Okamoto, Hiroshi, E-mail: okamoto@akita-pu.ac.jp [Department of Electronics and Information Systems, Akita Prefectural University, Yurihonjo 015-0055 (Japan); Nagatani, Yukinori [National Institute for Physiological Sciences, Okazaki 444-8787 (Japan)

    2014-02-10T23:59:59.000Z

    A notorious problem in high-resolution biological electron microscopy is radiation damage caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches may represent the only way to improve the resolution in this context, but all proposed schemes to date demand delicate control of the electron beam in highly unconventional electron optics. Here we propose a scheme that involves a flux qubit based on a radio-frequency superconducting quantum interference device, inserted in a transmission electron microscope. The scheme significantly improves the prospect of realizing a quantum-enhanced electron microscope for radiation-sensitive specimens.

  11. High Gain, Fast Scan, Broad Spectrum, Parallel Beam Wavelength Dispersive X-ray Spectrometer for SEM

    SciTech Connect (OSTI)

    David OHara; Dr. Eric Lochmer

    2003-09-12T23:59:59.000Z

    Parallax Research, Inc. proposes to produce a new type of x-ray spectrometer for use with Scanning Electron Microscopy (SEM) that would have the energy resolution of WDS and the ease of use of EDS with sufficient gain for lower energies that it can be used at low beam currents as is EDS. Parallax proposes to do this by development of new multiple reflection x-ray collimation optics, new diffractor technology, new detector technology and new scan algorithms.

  12. Dynamic Characterization of Graphene Growth and Etching by Oxygen on Ru(0001) by Photoemission Electron Microscopy

    E-Print Network [OSTI]

    Bao, Xinhe

    Dynamic Characterization of Graphene Growth and Etching by Oxygen on Ru(0001) by Photoemission of graphene on Ru(0001) was investigated by photoemission electron microscopy (PEEM) and scanning tunneling, we show that graphene overlayers with sizes ranging from nanometers to sub-millimeters have been

  13. Convective heat flow probe

    DOE Patents [OSTI]

    Dunn, J.C.; Hardee, H.C.; Striker, R.P.

    1984-01-09T23:59:59.000Z

    A convective heat flow probe device is provided which measures heat flow and fluid flow magnitude in the formation surrounding a borehole. The probe comprises an elongate housing adapted to be lowered down into the borehole; a plurality of heaters extending along the probe for heating the formation surrounding the borehole; a plurality of temperature sensors arranged around the periphery of the probe for measuring the temperature of the surrounding formation after heating thereof by the heater elements. The temperature sensors and heater elements are mounted in a plurality of separate heater pads which are supported by the housing and which are adapted to be radially expanded into firm engagement with the walls of the borehole. The heat supplied by the heater elements and the temperatures measured by the temperature sensors are monitored and used in providing the desired measurements. The outer peripheral surfaces of the heater pads are configured as segments of a cylinder and form a full cylinder when taken together. A plurality of temperature sensors are located on each pad so as to extend along the length and across the width thereof, with a heating element being located in each pad beneath the temperature sensors. An expansion mechanism driven by a clamping motor provides expansion and retraction of the heater pads and expandable packet-type seals are provided along the probe above and below the heater pads.

  14. Multispectral imaging probe

    DOE Patents [OSTI]

    Sandison, D.R.; Platzbecker, M.R.; Descour, M.R.; Armour, D.L.; Craig, M.J.; Richards-Kortum, R.

    1999-07-27T23:59:59.000Z

    A multispectral imaging probe delivers a range of wavelengths of excitation light to a target and collects a range of expressed light wavelengths. The multispectral imaging probe is adapted for mobile use and use in confined spaces, and is sealed against the effects of hostile environments. The multispectral imaging probe comprises a housing that defines a sealed volume that is substantially sealed from the surrounding environment. A beam splitting device mounts within the sealed volume. Excitation light is directed to the beam splitting device, which directs the excitation light to a target. Expressed light from the target reaches the beam splitting device along a path coaxial with the path traveled by the excitation light from the beam splitting device to the target. The beam splitting device directs expressed light to a collection subsystem for delivery to a detector. 8 figs.

  15. Local tunneling characteristics near a grain boundary of a d-wave superconductor as probed by a normal-metal or a low-T-c-superconductor STM tip

    E-Print Network [OSTI]

    Zhao, HW; Hu, Chia-Ren.

    2000-01-01T23:59:59.000Z

    minimum ~i.e., zero! for a $100% 5 PRB 620163-1829/2000/62~2!/1308~11!/$15.00 y of a d-wave superconductor as probed c-superconductor STM tip d Chia-Ren Hu , College Station, Texas 77843-4242 r 1999! s @as observed with scanning tunnel microscopy... direction is along the c axis in this figure, but it does not have to be so. PRB 62 LOCAL TUNNELING CHARACTERISTIC Elul~x1!5h? 0ul~xl!1E D~s,r!v l~x2!dx2, ~2! Elv l~xl!52h? 0v l~x1!1E D~s,r!ul~x2!dx2, ~3! where s[(x12x2), r[(x11x2)/2, and h? 0[2q2?x1 2...

  16. Probing Mercury's Partnering Preferences

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOE Office of Science (SC)IntegratedSpeedingTechnical News, informationPriority Firm Exchange . .ProbingProbing

  17. Ultrahigh resolution multicolor colocalization of single fluorescent probes

    DOE Patents [OSTI]

    Weiss, Shimon; Michalet, Xavier; Lacoste, Thilo D.

    2005-01-18T23:59:59.000Z

    A novel optical ruler based on ultrahigh-resolution colocalization of single fluorescent probes is described. Two unique families of fluorophores are used, namely energy-transfer fluorescent beads and semiconductor nanocrystal (NC) quantum dots, that can be excited by a single laser wavelength but emit at different wavelengths. A novel multicolor sample-scanning confocal microscope was constructed which allows one to image each fluorescent light emitter, free of chromatic aberrations, by scanning the sample with nanometer scale steps using a piezo-scanner. The resulting spots are accurately localized by fitting them to the known shape of the excitation point-spread-function of the microscope.

  18. Eddy current scanning at Fermilab

    SciTech Connect (OSTI)

    Boffo, C.; Bauer, P.; Foley, M.; /Fermilab; Brinkmann, A.; /DESY; Ozelis, J.; /Jefferson Lab

    2005-07-01T23:59:59.000Z

    In the framework of SRF cavity development, Fermilab is creating the infrastructure needed for the characterization of the material used in the cavity fabrication. An important step in the characterization of ''as received'' niobium sheets is the eddy current scanning. Eddy current scanning is a non-destructive technique first adopted and further developed by DESY with the purpose of checking the cavity material for sub-surface defects and inclusions. Fermilab has received and further upgraded a commercial eddy current scanner previously used for the SNS project. The upgrading process included developing new filtering software. This scanner is now used daily to scan the niobium sheets for the Fermilab third harmonic and transverse deflecting cavities. This paper gives a status report on the scanning results obtained so far, including a discussion of the typology of signals being detected. We also report on the efforts to calibrate this scanner, a work conducted in collaboration with DESY.

  19. Langmuir probe diagnostic suite in the C-2 field-reversed configuration

    SciTech Connect (OSTI)

    Roche, T., E-mail: troche@trialphaenergy.com; Armstrong, S.; Knapp, K.; Slepchenkov, M. [Tri Alpha Energy Inc., PO Box 7010, Rancho Santa Margarita, California 92688 (United States); Sun, X. [Department of Modern Physics, University of Science and Technology of China, Hefei Anhui 230026 (China)

    2014-11-15T23:59:59.000Z

    Several in situ probes have been designed and implemented into the diagnostic array of the C-2 field-reversed configuration (FRC) at Tri Alpha Energy [M. Tuszewski et al. (the TAE Team), Phys. Rev. Lett. 108, 255008 (2012)]. The probes are all variations on the traditional Langmuir probe. They include linear arrays of triple probes, linear arrays of single-tipped swept probes, a multi-faced Gundestrup probe, and an ion-sensitive probe. The probes vary from 5 to 7 mm diameter in size to minimize plasma perturbations. They also have boron nitride outer casings that prevent unwanted electrical breakdown and reduce the introduction of impurities. The probes are mounted on motorized linear-actuators allowing for programmatic scans of the various plasma parameters over the course of several shots. Each probe has a custom set of electronics that allows for measurement of the desired signals. High frequency ( > 5MHz) analog optical-isolators ensure that plasma parameters can be measured at sub-microsecond time scales while providing electrical isolation between machine and data acquisition systems. With these probes time-resolved plasma parameters (temperature, density, spatial potential, flow, and electric field) can be directly/locally measured in the FRC jet and edge/scrape-off layer.

  20. Dynamic imaging with electron microscopy

    ScienceCinema (OSTI)

    Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

    2014-05-30T23:59:59.000Z

    Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

  1. Electron Spectrometer: Scanning Multiprobe Surface Analysis System...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scanning Multiprobe Surface Analysis System - Versaprobe Electron Spectrometer: Scanning Multiprobe Surface Analysis System - Versaprobe The SMSAS is a multi-technique surface...

  2. Analytical Electron Microscopy examination of uranium contamination at the DOE Fernald operation site

    SciTech Connect (OSTI)

    Buck, E.C.; Dietz, N.L.; Bates, J.K.; Cunnane, J.C.

    1993-02-01T23:59:59.000Z

    Analytical Electron Microscopy (AEM) has been used to identify uranium-bearing phases present in contaminated soils from the DOE Fernald operation site. A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and AEM was used in isolating and characterizing uranium-rich regions of the contaminated soils. Soil samples were prepared for transmission electron microscopy (TEM) by ultramicrotomy using an embedding resin previously employed for aquatic colloids and biological samples. This preparation method allowed direct comparison between SEM and TEM images. At the macroscopic level much of the uranium appears to be associated with clays in the soils; however, electron beam analysis revealed that the uranium is present as discrete phases, including iron oxides, silicates (soddyite), phosphates (autunites), and fluorite. Only low levels of uranium were actually within the clay minerals. The distribution of uranium phases was inhomogeneous at the submicron level.

  3. Optimizing and extending light-sculpting microscopy for fast functional imaging in neuroscience

    E-Print Network [OSTI]

    Rupprecht, Peter; Groessl, Florian; Haubensak, Wulf E; Vaziri, Alipasha

    2015-01-01T23:59:59.000Z

    A number of questions in systems biology such as understanding how dynamics of neuronal networks are related to brain function require the ability to capture the functional dynamics of large cellular populations at high speed. Recently, this has driven the development of a number of parallel and high speed imaging techniques such as light-sculpting microscopy, which has been used to capture neuronal dynamics at the whole brain and single cell level in small model organism. However, the broader applicability of light-sculpting microscopy is limited by the size of volumes for which high speed imaging can be obtained and scattering in brain tissue. Here, we present strategies for optimizing the present tradeoffs in light-sculpting microscopy. Various scanning modalities in light-sculpting microscopy are theoretically and experimentally evaluated, and strategies to maximize the obtainable volume speeds, and depth penetration in brain tissue using different laser systems are provided. Design-choices, important par...

  4. RESEARCH ENGINEER IN ADVANCED ANALYTICAL ELECTRON MICROSCOPY

    E-Print Network [OSTI]

    Gilchrist, James F.

    RESEARCH ENGINEER IN ADVANCED ANALYTICAL ELECTRON MICROSCOPY Department of Materials Science. #12;Job Description (for website) Job Title: Research Engineer in Advanced Analytical Electron or an engineering discipline and four years of demonstrated experience in electron microscopy. Requirements

  5. SINTERING OF A12O3 POWDER COMPACT BY HOT STAGE SCANNING ELECTRON MICROSCOPY

    E-Print Network [OSTI]

    Wang, D.N.-K.

    2010-01-01T23:59:59.000Z

    2 G3 WITH 0..1 WT. % MgG GENERAL ELECTRIC Co. GREEN DENSITY·compacts. WITH 0.1 WT. GENERAL ELECTRIC CO. EEN DENSITY: 40R. Grace, General Electric and Lniun Carbide Co:apa! lic,,~

  6. SCANNING ELECTRON MICROSCOPY AND PORE CASTING: CHEROKEE AND BUG FIELDS, SAN JUAN COUNTY, UTAH

    SciTech Connect (OSTI)

    Thomas C. Chidsey Jr; David E. Eby; Louis H. Taylor

    2003-12-01T23:59:59.000Z

    Over 400 million barrels (64 million m{sup 3}) of oil have been produced from the shallow-shelf carbonate reservoirs in the Pennsylvanian (Desmoinesian) Paradox Formation in the Paradox Basin, Utah and Colorado. With the exception of the giant Greater Aneth field, the other 100 plus oil fields in the basin typically contain 2 to 10 million barrels (0.3-1.6 million m{sup 3}) of original oil in place. Most of these fields are characterized by high initial production rates followed by a very short productive life (primary), and hence premature abandonment. Only 15 to 25 percent of the original oil in place is recoverable during primary production from conventional vertical wells. An extensive and successful horizontal drilling program has been conducted in the giant Greater Aneth field. However, to date, only two horizontal wells have been drilled in small Ismay and Desert Creek fields. The results from these wells were disappointing due to poor understanding of the carbonate facies and diagenetic fabrics that create reservoir heterogeneity. These small fields, and similar fields in the basin, are at high risk of premature abandonment. At least 200 million barrels (31.8 million m{sup 3}) of oil will be left behind in these small fields because current development practices leave compartments of the heterogeneous reservoirs undrained. Through proper geological evaluation of the reservoirs, production may be increased by 20 to 50 percent through the drilling of low-cost single or multilateral horizontal legs from existing vertical development wells. In addition, horizontal drilling from existing wells minimizes surface disturbances and costs for field development, particularly in the environmentally sensitive areas of southeastern Utah and southwestern Colorado.

  7. Characterization and Theory of Electrocatalysts Based on Scanning Electrochemical Microscopy Screening Methods

    E-Print Network [OSTI]

    Henkelman, Graeme

    .g., by water-in-oil micro- emulsion or template methods), prepare carbon-supported catalysts state...). 7. Carry out theoretical studies of the catalyst to improve models for how they work

  8. Identification of concrete deteriorating minerals by polarizing and scanning electron microscopy

    SciTech Connect (OSTI)

    Gregerova, Miroslava, E-mail: mirka@sci.muni.cz [Masaryk University in Brno, Faculty of Science, Institute of Geological Sciences, Kotlarska 2, 611 37 Brno (Czech Republic); Vsiansky, Dalibor, E-mail: daliborv@centrum.cz [Research Institute of Building Materials, JSC., Hnevkovskeho 65, 617 00 Brno (Czech Republic)

    2009-07-15T23:59:59.000Z

    The deterioration of concrete represents one of the most serious problems of civil engineering worldwide. Besides other processes, deterioration of concrete consists of sulfate attack and carbonation. Sulfate attack results in the formation of gypsum, ettringite and thaumasite in hardened concrete. Products of sulfate attack may cause a loss of material strength and a risk of collapse of the concrete constructions. The authors focused especially on the microscopical research of sulfate attack. Concrete samples were taken from the Charles Bridge in Prague, Czech Republic. A succession of degrading mineral formation was suggested. Microscope methods represent a new approach to solving the deterioration problems. They enable evaluation of the state of concrete constructions and in cooperation with hydro-geochemistry, mathematics and statistics permit prediction of the durability of a structure. Considering the number of concrete constructions and their age, research of concrete deterioration has an increasing importance. The results obtained can also be useful for future construction, because they identify the risk factors associated with formation of minerals known to degrade structures.

  9. Scanning Tunneling Microscopy Studies of Metal Clusters Supported on Graphene and Silica Thin Film 

    E-Print Network [OSTI]

    Zhou, Zihao

    2012-10-19T23:59:59.000Z

    with other traditional surface science techniques. In the study of the graphene/Ru(0001) system, the key factors that govern the growth and distribution of metals on the graphene have been studied based on different behaviors of five transition metals...

  10. Scanning tunneling microscopy studies on the structure and stability of model catalysts

    E-Print Network [OSTI]

    Yang, Fan

    2009-05-15T23:59:59.000Z

    assistance has largely facilitated the writing of this dissertation. viii TABLE OF CONTENTS Page ABSTRACT .............................................................................................................. iii DEDICATION... of the Auger processes (KL 1 L 2,3 ). (a) Ionization of a core electron. (b) Excitation of an Auger electron........ 34 Figure 9 The performance and vibration isolation of the RHK VT-UHV300 STM. (a) Atomic resolution STM images obtained by RHK...

  11. Scanning tunneling microscopy of doping and composilionallll-V homo.. and heterostructures

    E-Print Network [OSTI]

    and compositional effects can be resolved by the topographic contrasts of constant-current STM images. The samples sections of sam~ pIes were prepared by two methods: (1) in situ cleaving in an UHY c

  12. Scanning Tunneling Microscopy Studies of Metal Clusters Supported on Graphene and Silica Thin Film

    E-Print Network [OSTI]

    Zhou, Zihao

    2012-10-19T23:59:59.000Z

    with other traditional surface science techniques. In the study of the graphene/Ru(0001) system, the key factors that govern the growth and distribution of metals on the graphene have been studied based on different behaviors of five transition metals...

  13. A revision of generic concepts in the subfamily Acetabularieae (Acetabulariaceae, dasycladales) based on scanning electron microscopy

    E-Print Network [OSTI]

    Bailey, Glenn Paul

    1975-01-01T23:59:59.000Z

    by Eiseman (1970) in Lake Surprise, Florida. He reported a variety of phenotypes which formed a continuum between Chalmasia antillana Solms-Laubach, 1895 (calcified cysts} and Acetabularia farlowii Solms-Laubach, 1895 (uncalcified cysts). He concluded... lime matrix between adjacent cysts similar to the type of calcification in the genus Acicularia. He also reported a difference in crystal habits produced by species of Acetabularia anti liana. found in two different habitats, again indicating...

  14. REVIEW OF SCIENTIFIC INSTRUMENTS 83, 034704 (2012) Low temperature laser scanning microscopy of a superconducting

    E-Print Network [OSTI]

    Anlage, Steven

    2012-01-01T23:59:59.000Z

    Thomas Jefferson National Accelerator Facility, 12000 Jefferson Avenue, Newport News, Virginia 23606, USA of achievable accelerating gradients, has been continuously improving over the years. Niobium, either as a thin in high-temperature superconductors (HTS).6 The origins of the technique go back to electron-beam heating7

  15. SINTERING OF A12O3 POWDER COMPACT BY HOT STAGE SCANNING ELECTRON MICROSCOPY

    E-Print Network [OSTI]

    Wang, D.N.-K.

    2010-01-01T23:59:59.000Z

    from W. R. Grace, General Electric and Lniun Carbide Co:apa!2 G3 WITH 0..1 WT. % MgG GENERAL ELECTRIC Co. GREEN DENSITY·compacts. WITH 0.1 WT. GENERAL ELECTRIC CO. EEN DENSITY: 40

  16. SINTERING OF A12O3 POWDER COMPACT BY HOT STAGE SCANNING ELECTRON MICROSCOPY

    E-Print Network [OSTI]

    Wang, D.N.-K.

    2010-01-01T23:59:59.000Z

    previous investigators for Linde-A A1 20 3 with MgO dopant (by previous investigators for Linde-A A1 0 with MgO dopant (by Jorgensen for undoped Linde-A A1 0 (Ref. 18), Jorgensen's

  17. Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research

    E-Print Network [OSTI]

    Moffet, Ryan C.

    2011-01-01T23:59:59.000Z

    X-ray microscope at BESSY II. Journal of SynchrotronSaskatoon, Canada), 11 BESSY II (Berlin, Germany), 12 Swiss

  18. Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research

    E-Print Network [OSTI]

    Moffet, Ryan C.

    2011-01-01T23:59:59.000Z

    microscope at BESSY II. Journal of Synchrotron Radiation ,BESSY II (Berlin, Germany), 12 Swiss Light Source (Paul Scherrer Institut, Villingen, Switzerland), 13 Elettra (Trieste, Italy), 14 European Synchrotron

  19. Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research

    E-Print Network [OSTI]

    Moffet, Ryan C.

    2011-01-01T23:59:59.000Z

    to those of fulvic acid and tar balls. 38 The secondary/The spectra from these acids and the tar balls all containsamples as the tar balls), humic and fulvic acids. Tar ball

  20. Scanning tunnelling microscopy and spectroscopy of ultra-flat graphene on hexagonal boron nitride

    E-Print Network [OSTI]

    Xue, Jiamin

    Graphene has demonstrated great promise for future electronics technology as well as fundamental physics applications because of its linear energy–momentum dispersion relations which cross at the Dirac point1, 2. However, ...

  1. Cathodoluminescent properties at nanometer resolution through Z-contrast scanning transmission electron microscopy

    E-Print Network [OSTI]

    Pennycook, Steve

    another factor to be crucial to external radiative efficiency, the porosity of the films. Poros- ity information about the deposition can be found elsewhere.10 Cross-sectional slices were obtained by cutting a , the sample prepared at 735 °C, 10 Hz shows a high density of pores at the edge of the sample, with an average

  2. A technique for quantitative and qualitative viewing of aquatic bacteria using scanning electron microscopy 

    E-Print Network [OSTI]

    Dreier, Thomas Michael

    1977-01-01T23:59:59.000Z

    microscopic enumeration techniques. Water samples are concentrated on pre-wetted (Triton X-100) Nuclepore filters (0. 2 um pore size) to prov1de a uniform distri- bution of bacteria on the filter surface and vacuum filtered (660 Torr). The filter... is transferred to a petri dish containing filter paper soaked 1n 2% glutaraldehyde and the bacter1a are fixed for one hour. Dehydration 1s performed by transferr1ng the filters through a series of petri dishes conta1ning filter paper saturated with 25, 50, 75...

  3. A technique for quantitative and qualitative viewing of aquatic bacteria using scanning electron microscopy

    E-Print Network [OSTI]

    Dreier, Thomas Michael

    1977-01-01T23:59:59.000Z

    microscopic enumeration techniques. Water samples are concentrated on pre-wetted (Triton X-100) Nuclepore filters (0. 2 um pore size) to prov1de a uniform distri- bution of bacteria on the filter surface and vacuum filtered (660 Torr). The filter... is transferred to a petri dish containing filter paper soaked 1n 2% glutaraldehyde and the bacter1a are fixed for one hour. Dehydration 1s performed by transferr1ng the filters through a series of petri dishes conta1ning filter paper saturated with 25, 50, 75...

  4. Supplementary Information: An Experimental Demonstration Of Scanned Spin-Precession Microscopy

    E-Print Network [OSTI]

    Stroud, David

    the top layer forms the membrane. A nominally lattice-matched InGaP layer is grown under this device layer a recipe given elsewhere1 . The etch stops at the InGaP layer because of the high etch selectivity. The InGaP-manipulators, under an optical microscope. n-GaAs, 1000 nm Si: 1.4e22 m3 (Si doped) n-InGaP

  5. Charge-density-wave origin of cuprate checkerboard visualized by scanning tunnelling microscopy

    E-Print Network [OSTI]

    Wise, W. D.

    One of the main challenges in understanding high-Tc superconductivity is to disentangle the rich variety of states of matter that may coexist, cooperate or compete with d-wave superconductivity. At centre stage is the ...

  6. Study of perineal patterns of four species of Meloidogyne (Nematoda:Heteroderoidea) using scanning electron microscopy

    E-Print Network [OSTI]

    Khan, Zainab Najafali

    1978-01-01T23:59:59.000Z

    , except that in M. ~ha la a raised and clearly differentiated tail area was always observed. M. ~fco it hibited tiy a high d I a h. The inner st 1- tions around the vulva and up the tail area formed a distinctive pear shape. The lateral field... was sometimes differentiated. The vulval lip striations were present and a whorl in the tail area was p o inent. M. java ica had both Iow and high d a1 a h . The typical lateral lines and pattern rays were seen in most specimens. A whorl in the tail area...

  7. Atomic force and scanning tunneling microscopy analysis of palladium and silver nanophase materials

    E-Print Network [OSTI]

    Sattler, Klaus

    . INTRODUCTION Nanophase materials consolidated from atom clusters produced by the gas condensation method be made by gas condensation, not only at the labo- ratory scale but also in commercial production and properties of nano- phase materials assembled by consolidating gas-condensed atom clusters in vacuum have

  8. Internal Image Potential in Semiconductors - Effect on Scanning-Tunneling-Microscopy

    E-Print Network [OSTI]

    HUANG, ZH; WEIMER, M.; Allen, Roland E.

    1993-01-01T23:59:59.000Z

    The tunneling of electrons from a semiconductor surface to a metal tip, across a vacuum gap, is influenced by two image interactions: an attractive image potential in the vacuum region, which lowers the apparent tunneling barrier, and a repulsive...

  9. Quantifying Desorption of Saturated Hydrocarbons from Silicon with Quantum Calculations and Scanning Tunneling Microscopy

    E-Print Network [OSTI]

    Seideman, Tamar

    Quantifying Desorption of Saturated Hydrocarbons from Silicon with Quantum Calculations hydrocarbon on silicon, desorption is observed at bias magnitudes as low as 2.5 V, albeit the desorption with conventional silicon microelectronic tech- nology [17­22]. A detailed understanding of both the electronic

  10. Franz Leberl & Michael Gruber PHOTOGRAMMETRIC COLOR SCANNING

    E-Print Network [OSTI]

    Binford, Michael W.

    Franz Leberl & Michael Gruber 231 PHOTOGRAMMETRIC COLOR SCANNING Franz Leberl 1 , Michael Gruber 2 II, WG II/6 KEY WORDS: Photogrammetric scanning systems, color scanning, masked negative film, calibration, density standards, scanner testing ABSTRACT: Scanning of analog image material remains a key

  11. CASE SERIES Scanning Eye Movements in Homonymous

    E-Print Network [OSTI]

    Peli, Eli

    CASE SERIES Scanning Eye Movements in Homonymous Hemianopia Documented by Scanning Laser not be real but instead may be due to an artifact such as scanning eye movement. This article illustrates a way to separate the actual visual field sparing from scanning eye movement artifact by using perimetry

  12. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E; Parvin, Bahram

    2013-10-01T23:59:59.000Z

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  13. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E. (Martinez, CA); Parvin, Bahram (Mill Valley, CA)

    2011-05-24T23:59:59.000Z

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  14. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Record-Setting Microscopy Illuminates Energy Storage Materials Print Thursday, 22 January 2015 12:10 X-ray microscopy...

  15. Scanning tunneling microscope nanoetching method

    DOE Patents [OSTI]

    Li, Yun-Zhong (West Lafayette, IN); Reifenberger, Ronald G. (West Lafayette, IN); Andres, Ronald P. (West Lafayette, IN)

    1990-01-01T23:59:59.000Z

    A method is described for forming uniform nanometer sized depressions on the surface of a conducting substrate. A tunneling tip is used to apply tunneling current density sufficient to vaporize a localized area of the substrate surface. The resulting depressions or craters in the substrate surface can be formed in information encoding patterns readable with a scanning tunneling microscope.

  16. Hyperspectral Microscopy of Explosives Particles Using an External Cavity Quantum Cascade Laser

    SciTech Connect (OSTI)

    Phillips, Mark C.; Bernacki, Bruce E.

    2012-12-26T23:59:59.000Z

    Using infrared hyperspectral imaging, we demonstrate microscopy of small particles of the explosives compounds RDX, tetryl, and PETN with near diffraction-limited performance. The custom microscope apparatus includes an external cavity quantum cascade laser illuminator scanned over its tuning range of 9.13-10.53 µm in four seconds, coupled with a microbolometer focal plane array to record infrared transmission images. We use the hyperspectral microscopy technique to study the infrared absorption spectra of individual explosives particles, and demonstrate sub-nanogram detection limits.

  17. Experimental probes of axions

    SciTech Connect (OSTI)

    Chou, Aaron S.; /Fermilab

    2009-10-01T23:59:59.000Z

    Experimental searches for axions or axion-like particles rely on semiclassical phenomena resulting from the postulated coupling of the axion to two photons. Sensitive probes of the extremely small coupling constant can be made by exploiting familiar, coherent electromagnetic laboratory techniques, including resonant enhancement of transitions using microwave and optical cavities, Bragg scattering, and coherent photon-axion oscillations. The axion beam may either be astrophysical in origin as in the case of dark matter axion searches and solar axion searches, or created in the laboratory from laser interactions with magnetic fields. This note is meant to be a sampling of recent experimental results.

  18. Probing metal solidification nondestructively

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOE Office of Science (SC)IntegratedSpeedingTechnical News, informationPriority Firm ExchangeSynchrotronProbing

  19. An ultrahigh vacuum fast-scanning and variable temperature scanning tunneling microscope for large scale imaging

    E-Print Network [OSTI]

    Pohl, Karsten

    An ultrahigh vacuum fast-scanning and variable temperature scanning tunneling microscope for large describe the design and performance of a fast-scanning, variable temperature scanning tunneling microscope of the scanner tube. The total scanning area is about 8 8 m2 . The sample temperature can be adjusted by a few

  20. Monte Carlo simulation study of scanning Auger electron images

    SciTech Connect (OSTI)

    Li, Y. G.; Ding, Z. J. [Department of Physics and Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026 (China); Zhang, Z. M. [Department of Astronomy and Applied Physics, University of Science and Technology of China, Hefei, Anhui 230026 (China)

    2009-07-15T23:59:59.000Z

    Simulation of contrast formation in Auger electron imaging of surfaces is helpful for analyzing scanning Auger microscopy/microanalysis (SAM) images. In this work, we have extended our previous Monte Carlo model and the simulation method for calculation of scanning electron microscopy (SEM) images to SAM images of complex structures. The essentials of the simulation method are as follows. (1) We use a constructive solid geometry modeling for a sample geometry, which is complex in elemental distribution, as well as in topographical configuration and a ray-tracing technique in the calculation procedure of electron flight steps that across the different element zones. The combination of the basic objects filled with elements, alloys, or compounds enables the simulation to a variety of sample geometries. (2) Sampled Auger signal electrons with a characteristic energy are generated in the simulation following an inner-shell ionization event, whose description is based on the Castani's inner-shell ionization cross section. This paper discusses in detail the features of simulated SAM images and of line scans for structured samples, i.e., the objects embedded in a matrix, under various experimental conditions (object size, location depth, beam energy, and the incident angle). Several effects are predicted and explained, such as the contrast reversion for nanoparticles in sizes of 10-60 nm, the contrast enhancement for particles made of different elements and wholly embedded in a matrix, and the artifact contrast due to nearby objects containing different elements. The simulated SAM images are also compared with the simulated SEM images of secondary electrons and of backscattered electrons. The results indicate that the Monte Carlo simulation can play an important role in quantitative SAM mapping.

  1. Automation of BESSY scanning tables

    E-Print Network [OSTI]

    Hanton, J

    1981-01-01T23:59:59.000Z

    A microprocessor M6800 is used for the automation of scanning and premeasuring BESSY tables. The tasks achieved by the microprocessor are: control of spooling of the four asynchronous film winding devices and switching on and off the 4 projection lamps; preprocessing of the data coming from a bipolar coordinates measuring device; bidirectional interchange of information between the operator, the BESSY table and the DEC PDP 11/34 mini computer controlling the scanning operations; control of the magnification on the table by swapping the projection lenses of appropriate focal lengths and the associated light boxes (under development). In connection with the last of these, study is being made for the use of BESSY tables for accurate measurements (+/- 5 microns), by encoding the displacements of the projection lenses. (0 refs).

  2. Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization...

  3. Probing Multiparton Correlations at CEBAF

    E-Print Network [OSTI]

    Jianwei Qiu

    1998-08-08T23:59:59.000Z

    In this talk, I explore the possibilities of probing the multiparton correlation functions at CEBAF at its current energy and the energies with its future upgrades.

  4. Photoemission electron microscopy of localized surface plasmons in silver nanostructures at telecommunication wavelengths

    E-Print Network [OSTI]

    Mårsell, Erik; Arnold, Cord L; Xu, Hongxing; Mauritsson, Johan; Mikkelsen, Anders

    2015-01-01T23:59:59.000Z

    We image the field enhancement at Ag nanostructures using femtosecond laser pulses with a center wavelength of 1.55 micrometer. Imaging is based on non-linear photoemission observed in a photoemission electron microscope (PEEM). The images are directly compared to ultra violet PEEM and scanning electron microscopy (SEM) imaging of the same structures. Further, we have carried out atomic scale scanning tunneling microscopy (STM) on the same type of Ag nanostructures and on the Au substrate. Measuring the photoelectron spectrum from individual Ag particles shows a larger contribution from higher order photoemission process above the work function threshold than would be predicted by a fully perturbative model, consistent with recent results using shorter wavelengths. Investigating a wide selection of both Ag nanoparticles and nanowires, field enhancement is observed from 30% of the Ag nanoparticles and from none of the nanowires. No laser-induced damage is observed of the nanostructures neither during the PEEM ...

  5. SCANNING TOUR SUMMARY REPORT PRICING EXPERIENCE IN NORTHERN EUROPE

    E-Print Network [OSTI]

    Minnesota, University of

    #12;SCANNING TOUR SUMMARY REPORT PRICING EXPERIENCE IN NORTHERN EUROPE: LESSONS LEARNED...........................................................................................1 2. PURPOSE OF SCANNING TOUR..........................................................................................................................30 PARTICIPANTS IN SCANNING TOUR SCANNING TOUR HOSTS #12;Scanning Tour Summary Report 1 October 20

  6. ARM: W-Band Scanning ARM Cloud Radar (W-SACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Widener, Kevin; Nelson, Dan; Bharadwaj, Nitin; Lindenmaier, Iosif [Andrei; Johnson, Karen

    W-Band Scanning ARM Cloud Radar (W-SACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  7. ARM: X-Band Scanning ARM Cloud Radar (XSACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Widener, Kevin; Nelson, Dan; Bharadwaj, Nitin; Lindenmaier, Iosif [Andrei; Johnson, Karen

    X-Band Scanning ARM Cloud Radar (XSACR) Hemispherical Sky RHI Scans (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  8. ARM: Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Bharadwaj, Nitin; Widener, Kevin

    Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

  9. CARS polarized microscopy of three-dimensional director structures in liquid crystals

    E-Print Network [OSTI]

    A. V. Kachynski; A. N. Kuzmin; P. N. Prasad; I. I. Smalyukh

    2007-10-18T23:59:59.000Z

    We demonstrate three-dimensional vibrational imaging of director structures in liquid crystals using coherent anti-Stokes Raman scattering (CARS) polarized microscopy. Spatial mapping of the structures is based on sensitivity of a polarized CARS signal to orientation of anisotropic molecules in liquid crystals. As an example, we study structures in a smectic material and demonstrate that single-scan CARS and two-photon fluorescence images of molecular orientation patterns are consistent with each other and with the structure model.

  10. Heat transfer probe

    DOE Patents [OSTI]

    Frank, Jeffrey I.; Rosengart, Axel J.; Kasza, Ken; Yu, Wenhua; Chien, Tai-Hsin; Franklin, Jeff

    2006-10-10T23:59:59.000Z

    Apparatuses, systems, methods, and computer code for, among other things, monitoring the health of samples such as the brain while providing local cooling or heating. A representative device is a heat transfer probe, which includes an inner channel, a tip, a concentric outer channel, a first temperature sensor, and a second temperature sensor. The inner channel is configured to transport working fluid from an inner inlet to an inner outlet. The tip is configured to receive at least a portion of the working fluid from the inner outlet. The concentric outer channel is configured to transport the working fluid from the inner outlet to an outer outlet. The first temperature sensor is coupled to the tip, and the second temperature sensor spaced apart from the first temperature sensor.

  11. Cosmological Probes for Supersymmetry

    E-Print Network [OSTI]

    Khlopov, Maxim

    2015-01-01T23:59:59.000Z

    The multi-parameter character of supersymmetric dark-matter models implies the combination of their experimental studies with astrophysical and cosmological probes. The physics of the early Universe provides nontrivial effects of non-equilibrium particles and primordial cosmological structures. Primordial black holes (PBHs) are a profound signature of such structures that may arise as a cosmological consequence of supersymmetric (SUSY) models. SUSY-based mechanisms of baryosynthesis can lead to the possibility of antimatter domains in a baryon asymmetric Universe. In the context of cosmoparticle physics, which studies the fundamental relationship of the micro- and macro-worlds, the development of SUSY illustrates the main principles of this approach, as the physical basis of the modern cosmology provides cross-disciplinary tests in physical and astronomical studies.

  12. Three-dimensional scanning confocal laser microscope

    DOE Patents [OSTI]

    Anderson, R. Rox (Lexington, MA); Webb, Robert H. (Lincoln, MA); Rajadhyaksha, Milind (Charlestown, MA)

    1999-01-01T23:59:59.000Z

    A confocal microscope for generating an image of a sample includes a first scanning element for scanning a light beam along a first axis, and a second scanning element for scanning the light beam at a predetermined amplitude along a second axis perpendicular to the first axis. A third scanning element scans the light beam at a predetermined amplitude along a third axis perpendicular to an imaging plane defined by the first and second axes. The second and third scanning element are synchronized to scan at the same frequency. The second and third predetermined amplitudes are percentages of their maximum amplitudes. A selector determines the second and third predetermined amplitudes such that the sum of the percentages is equal to one-hundred percent.

  13. Rotating concave eddy current probe

    SciTech Connect (OSTI)

    Roach, Dennis P. (Albuquerque, NM); Walkington, Phil (Albuquerque, NM); Rackow, Kirk A. (Albuquerque, NM); Hohman, Ed (Albuquerque, NM)

    2008-04-01T23:59:59.000Z

    A rotating concave eddy current probe for detecting fatigue cracks hidden from view underneath the head of a raised head fastener, such as a buttonhead-type rivet, used to join together structural skins, such as aluminum aircraft skins. The probe has a recessed concave dimple in its bottom surface that closely conforms to the shape of the raised head. The concave dimple holds the probe in good alignment on top of the rivet while the probe is rotated around the rivet's centerline. One or more magnetic coils are rigidly embedded within the probe's cylindrical body, which is made of a non-conducting material. This design overcomes the inspection impediment associated with widely varying conductivity in fastened joints.

  14. Scanning Options at the MSU Libraries

    E-Print Network [OSTI]

    Scanning Options at the MSU Libraries The Main Library, Engineering Library and Gast Business Library each have scanning services available. Service hours for each location are available at lib scanned copies of non-electronic journal articles and individual book chapters that the MSU Libraries own

  15. Understanding Localized-Scanning Worms Zesheng Chen

    E-Print Network [OSTI]

    Ji, Chuanyi

    Understanding Localized-Scanning Worms Zesheng Chen School of Electrical & Computer Engineering Email: jic@ece.gatech.edu Abstract-- Localized scanning is a simple technique used by attackers to search for vulnerable hosts. Localized scanning trades off between the local and the global search

  16. Optimal worm-scanning method using

    E-Print Network [OSTI]

    Ji, Chuanyi

    Optimal worm-scanning method using vulnerable-host distributions Zesheng Chen and Chuanyi Ji School}@ece.gatech.edu Abstract: Most Internet worms use random scanning. The distribution of vulnerable hosts on the Internet, however, is highly non-uniform over the IP-address space. This implies that random scanning wastes many

  17. Automatic building modeling from terrestrial laser scanning

    E-Print Network [OSTI]

    Pu, Shi

    Automatic building modeling from terrestrial laser scanning Shi Pu International Institute for Geo hard to recover 3D building structures from 2D image. Recent studies ([2] [6]) show that laser scanning imagery, airborne and terrestrial laser scanning give explicit 3D information, which enables the rapid

  18. Scanning/Transmission Electron Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645 3,625 1,006 492 742EnergyOnItemResearch > TheNuclearHomeland andEffectsScanning/Transmission Electron Microscopes

  19. Fast scanning mode and its realization in a scanning acoustic microscope

    SciTech Connect (OSTI)

    Ju Bingfeng; Bai Xiaolong; Chen Jian [The State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou 310027 (China)

    2012-03-15T23:59:59.000Z

    The scanning speed of the two-dimensional stage dominates the efficiency of mechanical scanning measurement systems. This paper focused on a detailed scanning time analysis of conventional raster and spiral scan modes and then proposed two fast alternative scanning modes. Performed on a self-developed scanning acoustic microscope (SAM), the measured images obtained by using the conventional scan mode and fast scan modes are compared. The total scanning time is reduced by 29% of the two proposed fast scan modes. It will offer a better solution for high speed scanning without sacrificing the system stability, and will not introduce additional difficulties to the configuration of scanning measurement systems. They can be easily applied to the mechanical scanning measuring systems with different driving actuators such as piezoelectric, linear motor, dc motor, and so on. The proposed fast raster and square spiral scan modes are realized in SAM, but not specially designed for it. Therefore, they have universal adaptability and can be applied to other scanning measurement systems with two-dimensional mechanical scanning stages, such as atomic force microscope or scanning tunneling microscope.

  20. Atomic-resolution study of Mn tetramer clusters using scanning tunneling Rong Yang, Haiqiang Yang, and Arthur R. Smitha

    E-Print Network [OSTI]

    Atomic-resolution study of Mn tetramer clusters using scanning tunneling microscopy Rong Yang clusters is investigated. The clusters are composed of a quadrant array of Mn atoms forming a tetramer of manganese nitride, on which are stabilized peri- odic, self-organized array of MnN-bonded Mn tetramer clus

  1. Measuring the quantum efficiency of single radiating dipoles using a scanning mirror

    E-Print Network [OSTI]

    B. C. Buchler; T. Kalkbrenner; C. Hettich; V. Sandoghdar

    2005-06-17T23:59:59.000Z

    Using scanning probe techniques, we show the controlled manipulation of the radiation from single dipoles. In one experiment we study the modification of the fluorescence lifetime of a single molecular dipole in front of a movable silver mirror. A second experiment demonstrates the changing plasmon spectrum of a gold nanoparticle in front of a dielectric mirror. Comparison of our data with theoretical models allows determination of the quantum efficiency of each radiating dipole.

  2. In Situ Electrochemical Transmission Electron Microscopy for...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    for Battery Research. Abstract: The recent development of in situ liquid stages for (scanning) transmission electron microscopes now makes it possible for us to study the details...

  3. Fiberoptic probe and system for spectral measurements

    DOE Patents [OSTI]

    Dai, S.; Young, J.P.

    1998-10-13T23:59:59.000Z

    A fused fiberoptic probe, a system, method and embodiments thereof for conducting spectral measurements are disclosed. The fused fiberoptic probe comprises a probe tip having a specific geometrical configuration, an exciting optical fiber and at least one collection optical fiber fused within a housing, preferably silica. The specific geometrical configurations in which the probe tip can be shaped include a slanted probe tip with an angle greater than 0{degree}, an inverted cone-shaped probe tip, and a lens head. 12 figs.

  4. Probing Ordered Lipid Assemblies with Polarized Third-Harmonic-Generation Microscopy Maxwell Zimmerley,1

    E-Print Network [OSTI]

    Paris-Sud XI, Université de

    the supramolecular organization of lipid arrays is critical for proper function, it cannot be studied in situ-wave mixing [11] (FWM), which are all sensitive to the electronic properties of the material, as well in NLOM (P-NLOM) can be used to reveal material anisotropy and molecular ordering by determining

  5. On single-molecule DNA sequencing with atomic force microscopy using functionalized carbon nanotube probes

    E-Print Network [OSTI]

    Burns, Daniel James

    2004-01-01T23:59:59.000Z

    A novel DNA sequencing method is proposed based on the specific binding nature of nucleotides and measured by an atomic force microscope (AFM). A single molecule of DNA is denatured and immobilized on an atomically fiat ...

  6. Long duration ash probe

    DOE Patents [OSTI]

    Hurley, J.P.; McCollor, D.P.; Selle, S.J.

    1994-07-26T23:59:59.000Z

    A long duration ash probe includes a pressure shell connected to a port in a combustor with a sample coupon mounted on a retractable carriage so as to retract the sample coupon within the pressure shell during soot blowing operation of the combustor. A valve mounted at the forward end of the pressure shell is selectively closeable to seal the sample coupon within the shell, and a heating element in the shell is operable to maintain the desired temperature of the sample coupon while retracted within the shell. The carriage is operably mounted on a pair of rails within the shell for longitudinal movement within the shell. A hollow carrier tube connects the hollow cylindrical sample coupon to the carriage, and extends through the carriage and out the rearward end thereof. Air lines are connected to the rearward end of the carrier tube and are operable to permit coolant to pass through the air lines and thence through the carrier tube to the sample coupon so as to cool the sample coupon. 8 figs.

  7. Long duration ash probe

    DOE Patents [OSTI]

    Hurley, John P. (Grand Forks, ND); McCollor, Don P. (Grand Forks, ND); Selle, Stanley J. (Grand Forks, MN)

    1994-01-01T23:59:59.000Z

    A long duration ash probe includes a pressure shell connected to a port in a combustor with a sample coupon mounted on a retractable carriage so as to retract the sample coupon within the pressure shell during sootblowing operation of the combustor. A valve mounted at the forward end of the pressure shell is selectively closeable to seal the sample coupon within the shell, and a heating element in the shell is operable to maintain the desired temperature of the sample coupon while retracted within the shell. The carriage is operably mounted on a pair of rails within the shell for longitudinal movement within the shell. A hollow carrier tube connects the hollow cylindrical sample coupon to the carriage, and extends through the carriage and out the rearward end thereof. Air lines are connected to the rearward end of the carrier tube and are operable to permit coolant to pass through the air lines and thence through the carrier tube to the sample coupon so as to cool the sample coupon.

  8. Optic probe for semiconductor characterization

    DOE Patents [OSTI]

    Sopori, Bhushan L. (Denver, CO); Hambarian, Artak (Yerevan, AM)

    2008-09-02T23:59:59.000Z

    Described herein is an optical probe (120) for use in characterizing surface defects in wafers, such as semiconductor wafers. The optical probe (120) detects laser light reflected from the surface (124) of the wafer (106) within various ranges of angles. Characteristics of defects in the surface (124) of the wafer (106) are determined based on the amount of reflected laser light detected in each of the ranges of angles. Additionally, a wafer characterization system (100) is described that includes the described optical probe (120).

  9. Methodology for assessing coastal change using terrestrial laser scanning

    E-Print Network [OSTI]

    Olsen, Michael J.

    2009-01-01T23:59:59.000Z

    Michelangelo Project: 3D Scanning of Large Statues,” Proc.for terrestrial laser scanning of long cliff sections inPress). Terrestrial laser scanning based structural damage

  10. Methodology for assessing coastal change using terrestrial laser scanning

    E-Print Network [OSTI]

    Olsen, Michael James

    2009-01-01T23:59:59.000Z

    for terrestrial laser scanning of long cliff sections inPress). Terrestrial laser scanning based structural damageresolution 3d laser scanning to slope stability studies. ”

  11. Sustainable Transportation: Findings from an International Scanning Review

    E-Print Network [OSTI]

    Deakin, Elizabeth

    2006-01-01T23:59:59.000Z

    FROM AN INTERNATIONAL SCANNING REVIEW AND INIPLICATIONS FORpart through an international scanning tour funded by the USThe group that conducted the scanning tour contributed ideas

  12. Scanning strategies for imaging arrays

    E-Print Network [OSTI]

    A. Kovacs

    2008-06-30T23:59:59.000Z

    Large-format (sub)millimeter wavelength imaging arrays are best operated in scanning observing modes rather than traditional position-switched (chopped) modes. The choice of observing mode is critical for isolating source signals from various types of noise interference, especially for ground-based instrumentation operating under a bright atmosphere. Ideal observing strategies can combat 1/f noise, resist instrumental defects, sensitively recover emission on large scales, and provide an even field coverage -- all under feasible requirements of telescope movement. This work aims to guide the design of observing patterns that maximize scientific returns. It also compares some of the popular choices of observing modes for (sub)millimeter imaging, such as random, Lissajous, billiard, spiral, On-The-Fly (OTF), DREAM, chopped and stare patterns. Many of the conclusions are also applicable other imaging applications and imaging in one dimension (e.g. spectroscopic observations).

  13. Monitoring probe for groundwater flow

    DOE Patents [OSTI]

    Looney, B.B.; Ballard, S.

    1994-08-23T23:59:59.000Z

    A monitoring probe for detecting groundwater migration is disclosed. The monitor features a cylinder made of a permeable membrane carrying an array of electrical conductivity sensors on its outer surface. The cylinder is filled with a fluid that has a conductivity different than the groundwater. The probe is placed in the ground at an area of interest to be monitored. The fluid, typically saltwater, diffuses through the permeable membrane into the groundwater. The flow of groundwater passing around the permeable membrane walls of the cylinder carries the conductive fluid in the same general direction and distorts the conductivity field measured by the sensors. The degree of distortion from top to bottom and around the probe is precisely related to the vertical and horizontal flow rates, respectively. The electrical conductivities measured by the sensors about the outer surface of the probe are analyzed to determine the rate and direction of the groundwater flow. 4 figs.

  14. Monitoring probe for groundwater flow

    DOE Patents [OSTI]

    Looney, Brian B. (Aiken, SC); Ballard, Sanford (Albuquerque, NM)

    1994-01-01T23:59:59.000Z

    A monitoring probe for detecting groundwater migration. The monitor features a cylinder made of a permeable membrane carrying an array of electrical conductivity sensors on its outer surface. The cylinder is filled with a fluid that has a conductivity different than the groundwater. The probe is placed in the ground at an area of interest to be monitored. The fluid, typically saltwater, diffuses through the permeable membrane into the groundwater. The flow of groundwater passing around the permeable membrane walls of the cylinder carries the conductive fluid in the same general direction and distorts the conductivity field measured by the sensors. The degree of distortion from top to bottom and around the probe is precisely related to the vertical and horizontal flow rates, respectively. The electrical conductivities measured by the sensors about the outer surface of the probe are analyzed to determine the rate and direction of the groundwater flow.

  15. STANDING WAVE PROBES FOR DIMENSIONAL METROLOGY OF LOW DENSITY FOAMS

    SciTech Connect (OSTI)

    Seugling, R M; Woody, S C; Bauza, M B

    2010-03-23T23:59:59.000Z

    Typically, parts and geometries of interest to LLNL are made from a combination of complex geometries and a wide array of different materials ranging from metals and ceramics to low density foams and plastic foils. These parts are combined to develop physics experiments for studying material properties, equation of state (EOS) and radiation transport. Understanding the dimensional uncertainty of the parts contained within an experiment is critical to the physical understanding of the phenomena being observed and represents the motivation for developing probe metrology capability that can address LLNL's unique problems. Standing wave probes were developed for measuring high aspect ratio, micrometer scaled features with nanometer resolution. Originally conceived of for the use in the automotive industry for characterizing fuel injector bores and similar geometries, this concept was investigated and improved for use on geometries and materials important to LLNL needs within target fabrication. As part of the original project, detailed understanding of the probe dynamics and interactions with the surface of the sample was investigated. In addition, the upgraded system was utilized for measuring fuel injector bores and micro-lenses as a means of demonstrating capability. This report discusses the use of the standing wave probe for measuring features in low density foams, 55 mg/cc SiO{sub 2} and 982 mg/cc (%6 relative density) copper foam respectively. These two foam materials represent a difficult metrology challenge because of their material properties and surface topography. Traditional non-contact metrology systems such as normal incident interferometry and/or confocal microscopy have difficulty obtaining a signal from the relatively absorptive characteristics of these materials. In addition to the foam samples, a solid copper and plastic (Rexolite{trademark}) sample of similar geometry was measured with the standing wave probe as a reference for both conductive and dielectric materials.

  16. Synthesis and characterization of carbon nanotubes using scanning probe based nano-lithographic techniques 

    E-Print Network [OSTI]

    Gargate, Rohit Vasant

    2009-05-15T23:59:59.000Z

    on these Fullerene coated substrates using “wet processes”. These substrates were then heated using either the integrated microheaters or external heaters in an inert atmosphere to obtain CNT. Thus, in this process we tried to obviate the Chemical Vapor Deposition...

  17. Synthesis and characterization of carbon nanotubes using scanning probe based nano-lithographic techniques

    E-Print Network [OSTI]

    Gargate, Rohit Vasant

    2009-05-15T23:59:59.000Z

    used for this study involved MEMS (Micro Electrical Mechanical Systems) elements and passive elements. These were coated with Fullerene using Physical Vapor Deposition or through a solution in an organic solvent. Catalyst precursors were deposited...

  18. Laser-assisted scanning probe alloying nanolithography (LASPAN) and its application in gold-silicon system

    E-Print Network [OSTI]

    Peng, Luohan

    2009-05-15T23:59:59.000Z

    nanostructures. Fundamental research is also being conducted to investigate structural, physical and chemical properties of the nanostructures. This research contributes fundamental understanding in surface science through development of a new methodology. Doing...

  19. Laser-assisted scanning probe alloying nanolithography (LASPAN) and its application in gold-silicon system 

    E-Print Network [OSTI]

    Peng, Luohan

    2009-05-15T23:59:59.000Z

    nanostructures. Fundamental research is also being conducted to investigate structural, physical and chemical properties of the nanostructures. This research contributes fundamental understanding in surface science through development of a new methodology. Doing...

  20. Development of a microfluidic device for patterning multiple species by scanning probe lithography 

    E-Print Network [OSTI]

    Rivas Cardona, Juan Alberto

    2009-06-02T23:59:59.000Z

    applications of Centiwell are also feasible for the various envisioned applications of DPN (and other SPL techniques) that were listed above. The Centiwell consists of a two-dimensional array of 96 microwells that are bulk micromachined on a silicon substrate...

  1. A scanning transmon qubit for strong coupling circuit quantum electrodynamics

    E-Print Network [OSTI]

    William E. Shanks; Devin L. Underwood; Andrew A. Houck

    2013-03-04T23:59:59.000Z

    Like a quantum computer designed for a particular class of problems, a quantum simulator enables quantitative modeling of quantum systems that is computationally intractable with a classical computer. Quantum simulations of quantum many-body systems have been performed using ultracold atoms and trapped ions among other systems. Superconducting circuits have recently been investigated as an alternative system in which microwave photons confined to a lattice of coupled resonators act as the particles under study with qubits coupled to the resonators producing effective photon-photon interactions. Such a system promises insight into the nonequilibrium physics of interacting bosons but new tools are needed to understand this complex behavior. Here we demonstrate the operation of a scanning transmon qubit and propose its use as a local probe of photon number within a superconducting resonator lattice. We map the coupling strength of the qubit to a resonator on a separate chip and show that the system reaches the strong coupling regime over a wide scanning area.

  2. Nanomaterials Analysis using a Scanning Electron Microscope ...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Nanomaterials Analysis using a Scanning Electron Microscope Technology available for licensing: Steradian X-ray detection system increases the detection capability of SEMs during...

  3. Imaging - Clearer brain scans ... | ornl.gov

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Imaging - Clearer brain scans ... A clever signal noise reduction strategy developed by a team that includes Oak Ridge National Laboratory's Ben Lawrie could dramatically improve...

  4. Surface plasmon resonance method for probing interactions in nanostructures: CdS nanoparticles linked to Au and Ag substrates by self-assembled hexanedithiol and aminoethanethiol monolayers

    SciTech Connect (OSTI)

    Hutter, E.; Fendler, J. H.; Roy, D.

    2001-08-15T23:59:59.000Z

    Self-assembled hexanedithiol (HDT) and aminoethanethiol (AET) monolayers (SAMs), {approx}0.4--0.8 nm in thickness, are used to link {approx}5 nm diam CdS nanoparticles covalently and electrostatically onto Au and Ag substrates. The resulting nanostructures are probed with scanning electron microscopy (SEM) and surface plasmon resonance (SPR) measurements. The CdS nanoparticle--SAM--substrate interactions manifesting themselves in the dielectric functions of the multilayered systems, are detected in the SPR data, and are discussed in terms of a phenomenological six-layer model. The SPR response of the Ag substrate is more sensitive to neighboring interactions than the Au substrate. The SEM images show that the CdS, connected either by HDT or AET onto Ag substrates, forms crystalline structures. The interactions responsible for this crystallization are absent in samples employing Au substrates, in which case only {approx}5 nm diam CdS nanoparticles are detected by SEM. The experimental results of the present article, analyzed in detail using Fresnel and Maxwell equations, demonstrate how the SPR technique can be used to characterize layered nanostructured materials. {copyright} 2001 American Institute of Physics.

  5. In-situ Transmission Electron Microscopy and Spectroscopy Studies...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Transmission Electron Microscopy and Spectroscopy Studies of Interfaces in Li-ion Batteries: Challenges and In-situ Transmission Electron Microscopy and Spectroscopy Studies of...

  6. In Situ Photoelectron Emission Microscopy of a Thermally Induced...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Emission Microscopy of a Thermally Induced Martensitic Transformation in a CuZnAI Shape Memory Alloy. In Situ Photoelectron Emission Microscopy of a Thermally Induced...

  7. Ultra-high Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    high Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization 2009 DOE Hydrogen Program and Vehicle...

  8. Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization Catalyst...

  9. ORNL microscopy pencils patterns in polymers at the nanoscale...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    (865) 574-7308 ORNL microscopy pencils patterns in polymers at the nanoscale Oak Ridge National Laboratory researchers used atomic force microscopy to draw nanoscale patterns in a...

  10. In-Situ Electron Microscopy of Electrical Energy Storage Materials...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials Investigations of electrode interface and architecture...

  11. Neutron and Gamma Probe Application to Hanford Tank 241-SY-101

    SciTech Connect (OSTI)

    CANNON, N.S.

    2000-02-01T23:59:59.000Z

    A neutron (moisture-sensitive) and gamma (in-situ radiation) probe technique has been utilized at a number of Hanford radioactive waste tanks for many years. This technology has been adapted for use in tank 241-SY-101's two Multifunction Instrument Trees (MITs) which have a hollow dry-well center opening two inches (51 cm) in diameter. These probes provide scans starting within a few inches of the tank bottom and traversing up through the top of the tank revealing a variety of waste features as a function of tank elevation. These features have been correlated with void fraction data obtained independently from two other devices, the Retained Gas Sampler (RGS) and the Void Fraction Instrument (VFI). The MIT probes offer the advantage of nearly continuous count-rate versus elevation scans and they can be operated significantly more often and at lower cost than temperature probes or the RGS or VFI devices while providing better depth resolution. The waste level in tank 241-SY-101 had been rising at higher rates than expected during 1998 and early 1999 indicating an increasing amount of trapped gas in the waste. The use of the MIT probes has assisted in evaluating changes in crust thickness and level and also in estimating relative changes in gas stored in the crust. This information is important in assuring that the tank remains in a safe configuration and will support safe waste transfer when those operations take place.

  12. City of College Station's Thermographic Mobile Scan

    E-Print Network [OSTI]

    Shear, C. K.

    1986-01-01T23:59:59.000Z

    During the first quarter of 1986, the City of College Station conducted a thermographic mobile scan of the entire city. A thermographic mobile scan is a process by which heat loss/heat gain data is accumulated by a vehicle traveling the city...

  13. 13:30-14:45 Octreotide Scan

    E-Print Network [OSTI]

    Wu, Yih-Min

    ; CT MRI RFA PET Octreotide Scan 24 #12;? ? · 1. ! ! · 2 2012-09-21 13:30-14:45 #12; 1. 2. 3. -, 4. 4. 5. 6. - 7. 8. Q&A #12; CT MRI RFA PET Octreotide Scan 24 #12; 2006 McGraw-Hill Higher Education

  14. An In Situ Study of the Martensitic Transformation in Shape Memory Alloys Using Photoemission Electron Microscopy

    SciTech Connect (OSTI)

    Cai, Mingdong; Langford, Stephen C.; Dickinson, J. T.; Xiong, Gang; Droubay, Timothy C.; Joly, Alan G.; Beck, Kenneth M.; Hess, Wayne P.

    2007-04-15T23:59:59.000Z

    Thermally-induced martensitic phase transformations in polycrystalline CuZnAl and thin-film NiTiCu shape memory alloys were probed using photoemission electron microscopy (PEEM). Ultra-violet photoelectron spectroscopy shows a reversible change in the apparent work function during transformation, presumably due to the contrasting surface electronic structures of the martensite and austenite phases. In situ PEEM images provide information on the spatial distribution of these phases and the evolution of the surface microstructure during transformation. PEEM offers considerable potential for improving our understanding of martensitic transformations in shape memory alloys in real time.

  15. Physical mechanisms of megahertz vibrations and nonlinear detection in ultrasonic force and related microscopies

    SciTech Connect (OSTI)

    Bosse, J. L.; Huey, B. D. [Department of Materials Science and Engineering, 97 North Eagleville Road, Unit 3136, Storrs, Connecticut 06269-3136 (United States); Tovee, P. D.; Kolosov, O. V., E-mail: o.kolosov@lancaster.ac.uk [Department of Physics, Lancaster University, Lancaster LA1 4YB (United Kingdom)

    2014-04-14T23:59:59.000Z

    Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced nanoscale property mapping to video rates, allowed use of cantilever dynamics for mapping nanomechanical properties of stiff materials, sensing ?s time scale phenomena in nanostructures, and enabled detection of subsurface features with nanoscale resolution. All of these methods critically depend on the generally poor characterized HF behaviour of AFM cantilevers in contact with a studied sample, spatial and frequency response of piezotransducers, and transfer of ultrasonic vibrations between the probe and a specimen. Focusing particularly on Ultrasonic Force Microscopy (UFM), this work is also applicable to waveguide UFM, heterodyne force microscopy, and near-field holographic microscopy, all methods that exploit nonlinear tip-surface force interactions at high frequencies. Leveraging automated multidimensional measurements, spectroscopic UFM (sUFM) is introduced to investigate a range of common experimental parameters, including piezotransducer excitation frequency, probed position, ultrasonic amplitude, cantilever geometry, spring constant, and normal force. Consistent with studies of influence of each of these factors, the data-rich sUFM signatures allow efficient optimization of ultrasonic-AFM based measurements, leading to best practices recommendations of using longer cantilevers with lower fundamental resonance, while at the same time increasing the central frequency of HF piezo-actuators, and only comparing results within areas on the order of few ?m{sup 2} unless calibrated directly or compared with in-the-imaged area standards. Diverse materials such as Si, Cr, and photoresist are specifically investigated. This work thereby provides essential insight into the reliable use of MHz vibrations with AFM and provides direct evidence substantiating phenomena such as sensitivity to adhesion, diminished friction for certain ultrasonic conditions, and the particular benefit of UFM and related methods for nanoscale mapping of stiff materials.

  16. Scanning tunneling microscope assembly, reactor, and system

    DOE Patents [OSTI]

    Tao, Feng; Salmeron, Miquel; Somorjai, Gabor A

    2014-11-18T23:59:59.000Z

    An embodiment of a scanning tunneling microscope (STM) reactor includes a pressure vessel, an STM assembly, and three spring coupling objects. The pressure vessel includes a sealable port, an interior, and an exterior. An embodiment of an STM system includes a vacuum chamber, an STM reactor, and three springs. The three springs couple the STM reactor to the vacuum chamber and are operable to suspend the scanning tunneling microscope reactor within the interior of the vacuum chamber during operation of the STM reactor. An embodiment of an STM assembly includes a coarse displacement arrangement, a piezoelectric fine displacement scanning tube coupled to the coarse displacement arrangement, and a receiver. The piezoelectric fine displacement scanning tube is coupled to the coarse displacement arrangement. The receiver is coupled to the piezoelectric scanning tube and is operable to receive a tip holder, and the tip holder is operable to receive a tip.

  17. Hand-held survey probe

    DOE Patents [OSTI]

    Young, Kevin L. (Idaho Falls, ID) [Idaho Falls, ID; Hungate, Kevin E. (Idaho Falls, ID) [Idaho Falls, ID

    2010-02-23T23:59:59.000Z

    A system for providing operational feedback to a user of a detection probe may include an optical sensor to generate data corresponding to a position of the detection probe with respect to a surface; a microprocessor to receive the data; a software medium having code to process the data with the microprocessor and pre-programmed parameters, and making a comparison of the data to the parameters; and an indicator device to indicate results of the comparison. A method of providing operational feedback to a user of a detection probe may include generating output data with an optical sensor corresponding to the relative position with respect to a surface; processing the output data, including comparing the output data to pre-programmed parameters; and indicating results of the comparison.

  18. Eddy current probe and method for flaw detection in metals

    DOE Patents [OSTI]

    Watjen, J.P.

    1987-06-23T23:59:59.000Z

    A flaw detecting system is shown which includes a probe having a pair of ferrite cores with in-line gaps in close proximity to each other. An insulating, non-magnetic, non-conducting holder fills the gaps and supports the ferrite cores in a manner such that the cores form a generally V-shape. Each core is provided with an excitation winding and a detection winding. The excitation windings are connected in series or parallel with an rf port for connection thereof to a radio frequency source. The detection windings, which are differentially wound, are connected in series circuit to a detector port for connection to a voltage measuring instrument. The ferrite cores at the in-line gaps directly engage the metal surface of a test piece, and the probe is scanned along the test piece. In the presence of a flaw in the metal surface the detection winding voltages are unbalanced, and the unbalance is detected by the voltage measuring instrument. The insulating holder is provided with a profile which conforms to that of a prominent feature of the test piece to facilitate movement of the probe along the feature, typically an edge or a corner. 9 figs.

  19. Eddy current probe and method for flaw detection in metals

    DOE Patents [OSTI]

    Watjen, John P. (Sunnyvale, CA)

    1987-06-23T23:59:59.000Z

    A flaw detecting system is shown which includes a probe having a pair of ferrite cores with in-line gaps in close proximity to each other. An insulating, non-magnetic, non-conducting holder fills the gaps and supports the ferrite cores in a manner such that the cores form a generally V-shape. Each core is provided with an excitation winding and a detection winding. The excitation windings are connected in series or parallel with an rf port for connection thereof to a radio frequency source. The detection windings, which are differentially wound, are connected in series circuit to a detector port for connection to a voltage measuring instrument. The ferrite cores at the in-line gaps directly engage the metal surface of a test piece, and the probe is scanned along the test piece. In the presence of a flaw in the metal surface the detection winding voltages are unbalanced, and the unbalance is detected by the voltage measuring instrument. The insulating holder is provided with a profile which conforms to that of a prominent feature of the test piece to facilitate movement of the probe along the feature, typically an edge or a corner.

  20. Cathodoluminescence of stacking fault bound excitons for local probing of the exciton diffusion length in single GaN nanowires

    E-Print Network [OSTI]

    Paris-Sud XI, Université de

    length in single GaN nanowires Gilles Nogues,1, 2, a) Thomas Auzelle,3 Martien Den Hertog,1, 2 Bruno correlated studies of individual GaN nanowires in scanning electron microscopy combined to low temperature that carrier diffusion length in InGaN and GaN bidimensional (2D) layers are rather small, in the range of 50

  1. Microrheological Studies of Regenerated Silk Fibroin Solution by Video Microscopy

    E-Print Network [OSTI]

    Raghu A; Somashekar R; Sharath Ananthamurthy

    2007-02-01T23:59:59.000Z

    We have carried out studies on the rheological properties of regenerated silk fibroin (RSF) solution using video microscopy. The degummed silk from the Bombyx mori silkworm was used to prepare RSF solution by dissolving it in calcium nitrate tetrahydrate-methanol solvent. Measurements were carried out by tracking the position of an embedded micron-sized polystyrene bead within the RSF solution through video imaging. The time dependent mean squared displacement (MSD) of the bead in solution and hence, the complex shear modulus of this solution was calculated from the bead's position information. An optical tweezer was used to transport and locate the bead at any desired site within the micro-volume of the sample, to facilitate the subsequent free-bead video analysis. We present here the results of rheological measurements of the silk polymer network in solution over a frequency range, whose upper limit is the frame capture rate of our camera, at full resolution. By examining the distribution of MSD of beads at different locations within the sample volume, we demonstrate that this probe technique enables us to detect local inhomogeneties at micrometer length scales, not detectable either by a rheometer or from diffusing wave spectroscopy.

  2. Conjugate adaptive optics in widefield microscopy with an extended-source wavefront sensor

    E-Print Network [OSTI]

    Li, Jiang; Paudel, Hari; Barankov, Roman; Bifano, Thomas; Mertz, Jerome

    2015-01-01T23:59:59.000Z

    Adaptive optics is a strategy to compensate for sample-induced aberrations in microscopy applications. Generally, it requires the presence of "guide stars" in the sample to serve as localized reference targets. We describe an implementation of conjugate adaptive optics that is amenable to widefield (i.e. non-scanning) microscopy, and can provide aberration corrections over potentially large fields of view without the use of guide stars. A unique feature of our implementation is that it is based on wavefront sensing with a single-shot partitioned-aperture sensor that provides large dynamic range compatible with extended samples. Combined information provided by this sensor and the imaging camera enable robust image de-blurring based on a rapid estimation of sample and aberrations obtained by closed-loop feedback. We present the theoretical principle of our technique and proof of concept experimental demonstrations.

  3. Potential applications of microscopy for steam coal

    SciTech Connect (OSTI)

    DeVanney, K.F.; Clarkson, R.J.

    1995-08-01T23:59:59.000Z

    Optical microscopy has been an extremely useful tool for many industrial sectors in the past. This paper introduces some of the potential applications of using coal and fly ash carbon microscopy for the combustion process and steam coal industry. Coal and fly ash carbon microscopic classification criteria are described. Plant sample data are presented which demonstrate that these techniques can be useful for coal selection and for problem solving in the coal-fired power plant environment. Practical recommendations for further study are proposed.

  4. Structure of low-density nanoporous dielectrics revealed by low-vacuum electron microscopy and small-angle x-ray scattering

    SciTech Connect (OSTI)

    Kucheyev, S O; Toth, M; Baumann, T F; Hamza, A V; Ilavsky, J; Knowles, W R; Thiel, B L; Tileli, V; van Buuren, T; Wang, Y M; Willey, T M

    2006-06-05T23:59:59.000Z

    We use low-vacuum scanning electron microscopy to image directly the ligament and pore size and shape distributions of representative aerogels over a wide range of length scales ({approx} 10{sup 0}-10{sup 5} nm). The images are used for unambiguous, real-space interpretation of small-angle scattering data for these complex nanoporous systems.

  5. Nuclear Physics with Electroweak Probes

    E-Print Network [OSTI]

    Omar Benhar

    2009-02-26T23:59:59.000Z

    In recent years, the italian theoretical Nuclear Physics community has played a leading role in the development of a unified approach, allowing for a consistent and fully quantitative description of the nuclear response to electromagnetic and weak probes. In this paper I review the main achievements in both fields, point out some of the open problems, and outline the most promising prospects.

  6. Cantilevered probe detector with piezoelectric element

    DOE Patents [OSTI]

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2013-04-30T23:59:59.000Z

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  7. Cantilevered probe detector with piezoelectric element

    DOE Patents [OSTI]

    Adams, Jesse D; Sulchek, Todd A; Feigin, Stuart C

    2014-04-29T23:59:59.000Z

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  8. Cantilevered probe detector with piezoelectric element

    DOE Patents [OSTI]

    Adams, Jesse D. (Reno, NV); Sulchek, Todd A. (Oakland, CA); Feigin, Stuart C. (Reno, NV)

    2012-07-10T23:59:59.000Z

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  9. Cantilevered probe detector with piezoelectric element

    DOE Patents [OSTI]

    Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C.

    2010-04-06T23:59:59.000Z

    A disclosed chemical detection system for detecting a target material, such as an explosive material, can include a cantilevered probe, a probe heater coupled to the cantilevered probe, and a piezoelectric element disposed on the cantilevered probe. The piezoelectric element can be configured as a detector and/or an actuator. Detection can include, for example, detecting a movement of the cantilevered probe or a property of the cantilevered probe. The movement or a change in the property of the cantilevered probe can occur, for example, by adsorption of the target material, desorption of the target material, reaction of the target material and/or phase change of the target material. Examples of detectable movements and properties include temperature shifts, impedance shifts, and resonant frequency shifts of the cantilevered probe. The overall chemical detection system can be incorporated, for example, into a handheld explosive material detection system.

  10. Handheld force-controlled ultrasound probe

    E-Print Network [OSTI]

    Gilbertson, Matthew Wright

    2010-01-01T23:59:59.000Z

    An hand-held force controlled ultrasound probe has been developed. The controller maintains a prescribed contact force between the probe and a patient's body. The device will enhance the diagnostic capability of free-hand ...

  11. Obama Administration Honors Department of Energy Scientists and...

    Energy Savers [EERE]

    V. Kalinin, Ph.D., Oak Ridge National Laboratory. For extraordinary insights into scanning probe microscopy principles and applying them to fundamental research in phase...

  12. Microsoft Word - Equipment-Training List

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scanning and Probing Microscopy Environmental Closed Loop Atomic Force Microscope - Asylum MFD-3D-BIO CFN Safety Module for Users - NC-ESH-USERS Cyber Security Training -...

  13. EERE Postdoctoral Research Award Participants

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Justin L. University of Connecticut Aging in Thin-Film Photovoltaics Predicted Using Scanning Probe Microscopy 2014 Knowles, Kathryn E. University of Washington Doped...

  14. Jeffrey R. Guest | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    optical properties of matter on nanometer length scales using ultrahigh vacuum scanning probe microscopy and 'single particle' laser spectroscopy techniques. He also studies...

  15. --No Title--

    Broader source: Energy.gov (indexed) [DOE]

    The Materials Technology Section is establishing scanning probe microscopy (SPM) and fuel cell battery testing capabilities in HTRL. Initial SPM testing will be on metal coupons...

  16. --No Title--

    Broader source: Energy.gov (indexed) [DOE]

    Materials Technology Section is establishing scanning probe microscopy (SPM) and fuel cell battery testing capabilities in HTRL. Initial SPM testing will be on metal coupons or...

  17. Grand Challenges of Characterization & Modeling of Cellulose...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    11 Technique Summary: *Microscopy: light, e-, ion, scanning probe *Diffraction: e-, neutron, x-ray *Inelastic Scattering: Raman *Scattering: DLS, *Spectroscopy: NMR, IR,...

  18. Calendar | OSTI, US Dept of Energy, Office of Scientific and...

    Office of Scientific and Technical Information (OSTI)

    double layers in ionic liquids 2015-02-02 14:38 Local electrochemical functionality in energy storage materials and devices by scanning probe microscopies: Status and perspectives...

  19. Local electrochemical functionality in energy storage materials...

    Office of Scientific and Technical Information (OSTI)

    devices by scanning probe microscopies: Status and perspectives Re-direct Destination: Energy storage and conversion systems are an integral component of emerging green...

  20. Spatial resolution in vector potential photoelectron microscopy

    SciTech Connect (OSTI)

    Browning, R. [R. Browning Consultants, 1 Barnhart Place, Shoreham, New York 11786 (United States)] [R. Browning Consultants, 1 Barnhart Place, Shoreham, New York 11786 (United States)

    2014-03-15T23:59:59.000Z

    The experimental spatial resolution of vector potential photoelectron microscopy is found to be much higher than expected because of the cancellation of one of the expected contributions to the point spread function. We present a new calculation of the spatial resolution with support from finite element ray tracing, and experimental results.

  1. Electron probe microanalysis in geoscience: a tutorial

    SciTech Connect (OSTI)

    Gooley, R.

    1981-01-01T23:59:59.000Z

    A tutorial on the history, theory and use of electron probe microanalysis in the geosciences is presented. (ACR)

  2. Probing Nanoscale Surface Enhanced Raman Scattering Fluctuation...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Nanoscale Surface Enhanced Raman Scattering Fluctuation Dynamics using Correalted AFM and Confocal Ultramicroscopy. Probing Nanoscale Surface Enhanced Raman Scattering Fluctuation...

  3. Scanning fluorescent microthermal imaging apparatus and method

    DOE Patents [OSTI]

    Barton, Daniel L. (Albuquerque, NM); Tangyunyong, Paiboon (Albuquerque, NM)

    1998-01-01T23:59:59.000Z

    A scanning fluorescent microthermal imaging (FMI) apparatus and method is disclosed, useful for integrated circuit (IC) failure analysis, that uses a scanned and focused beam from a laser to excite a thin fluorescent film disposed over the surface of the IC. By collecting fluorescent radiation from the film, and performing point-by-point data collection with a single-point photodetector, a thermal map of the IC is formed to measure any localized heating associated with defects in the IC.

  4. Scanning fluorescent microthermal imaging apparatus and method

    DOE Patents [OSTI]

    Barton, D.L.; Tangyunyong, P.

    1998-01-06T23:59:59.000Z

    A scanning fluorescent microthermal imaging (FMI) apparatus and method is disclosed, useful for integrated circuit (IC) failure analysis, that uses a scanned and focused beam from a laser to excite a thin fluorescent film disposed over the surface of the IC. By collecting fluorescent radiation from the film, and performing point-by-point data collection with a single-point photodetector, a thermal map of the IC is formed to measure any localized heating associated with defects in the IC. 1 fig.

  5. COMBINED FLUORESCENT AND GOLD PROBES FOR MICROSCOPIC AND MORPHOLOGICAL INVESTIGATIONS.

    SciTech Connect (OSTI)

    POWELL,R.D.HAINFELD,J.F.

    2002-04-17T23:59:59.000Z

    Nanogold{reg_sign}, a gold cluster with a core of gold atoms 1.4 nm in diameter, has proven to be a superior probe label for electron microscopy (EM), giving both higher labeling density and improved access to previously hindered or restricted antigens. It may be visualized by autometallography (AMG) for use in light microscopy (LM): silver-and gold-amplified Nanogold detection has proven to be one of the most sensitive methods available for the detection of low copy number targets such as viral DNA in cells and tissue specimens. AMG enhancement has also made Nanogold an effective detection label in blots and gels. The following protocols will be described: Labeling of nuclear components in cells. Protocol for in situ hybridization and detection with fluorescein-Nanogold--or Cy3{trademark}-Nanogold-labeled streptavidin. Nanogold is an inert molecule, and generally does not interact with biological molecules unless a specific chemical reactivity is introduced into the molecule. Conjugates are prepared using site-specific chemical conjugation through reactive chemical functionalities introduced during Nanogold preparation, which allows the gold label to be attached to a specific site on the conjugate biomolecule. For example, a maleimido-Nanogold derivative, which is specific for thiol binding, is frequently attached to the hinge region of an antibody at a unique thiol site generated by selective reduction of a hinge disulfide. This site is remote from the antigen combining region, and the Nanogold, therefore, does not compromise target binding. Nanogold may also be prepared with specific reactivity towards amines or other unique chemical groups. This mode of attachment enables the preparation of probes labeled with both Nanogold and fluorescent labels. Different chemical reactivities are used to attach the Nanogold and the fluorescent groups to different sites in the conjugate biomolecule, as shown in Figure 7.1. In this manner, the two labels are spaced sufficiently far apart that fluorescent resonance energy transfer does not quench the fluorescent signal, and the probes may be used to label specimens for fluorescent and EM observation in a single staining procedure. This reduces the complexity of the staining procedure, allowing less specimen perturbation, and also enables a higher degree of correlation between the fluorescence and EM localization of the target, thus increasing the usefulness of the complementary data sets. Since gold and fluorescent-labeled probes are often used at different concentrations under different conditions, optimum procedures for the use of fluorescent and gold probes may entail some degree of compromise between the most appropriate conditions for the two types of probes. However, the chemical stability of the Nanogold label means that it is generally stable to a wide range of use conditions, and the following protocols have been found to be effective for labeling specimens with combined fluorescein and Nanogold-labeled antibody Fab' probes and with combined Cy3 and Nanogold-labeled streptavidin.

  6. Aberration-Coreected Electron Microscopy at Brookhaven National Laboratory

    SciTech Connect (OSTI)

    Zhu,Y.; Wall, J.

    2008-04-01T23:59:59.000Z

    The last decade witnessed the rapid development and implementation of aberration correction in electron optics, realizing a more-than-70-year-old dream of aberration-free electron microscopy with a spatial resolution below one angstrom [1-9]. With sophisticated aberration correctors, modern electron microscopes now can reveal local structural information unavailable with neutrons and x-rays, such as the local arrangement of atoms, order/disorder, electronic inhomogeneity, bonding states, spin configuration, quantum confinement, and symmetry breaking [10-17]. Aberration correction through multipole-based correctors, as well as the associated improved stability in accelerating voltage, lens supplies, and goniometers in electron microscopes now enables medium-voltage (200-300kV) microscopes to achieve image resolution at or below 0.1nm. Aberration correction not only improves the instrument's spatial resolution but, equally importantly, allows larger objective lens pole-piece gaps to be employed thus realizing the potential of the instrument as a nanoscale property-measurement tool. That is, while retaining high spatial resolution, we can use various sample stages to observe the materials response under various temperature, electric- and magnetic- fields, and atmospheric environments. Such capabilities afford tremendous opportunities to tackle challenging science and technology issues in physics, chemistry, materials science, and biology. The research goal of the electron microscopy group at the Dept. of Condensed Matter Physics and Materials Science and the Center for Functional Nanomaterials, as well as the Institute for Advanced Electron Microscopy, Brookhaven National Laboratory (BNL), is to elucidate the microscopic origin of the physical- and chemical-behavior of materials, and the role of individual, or groups of atoms, especially in their native functional environments. We plan to accomplish this by developing and implementing various quantitative electron microscopy techniques in strongly correlated electron systems and nanostructured materials. As a first step, with the support of Materials Science Division, Office of Basic Energy Science, US Department of Energy, and the New York State Office of Science, Technology, and Academic Research, recently we acquired three aberration-corrected electron microscopes from the three major microscope manufacturers, i.e., JEOL, Hitachi, and FEI. The Hitachi HD2700C is equipped with a probe corrector, the FEI Titan 80-300 has an imaging corrector, while the JEOL2200MCO has both. All the correctors are of the dual-hexapole type, designed and manufactured by CEOS GmbH based on the design due to Rose and Haider [3, 18]. All these three are one-of-a-kind in the US, designed for specialized capabilities in characterizing nanoscale structure. In this chapter, we review the performance of these state-of-the art instruments and the new challenges associated with the improved spatial resolution, including the environment requirements of the laboratory that hosts these instruments. Although each instrument we describe here has its own strengths and drawbacks, it is not our intention to rank them in terms of their performance, especially their spatial resolution in imaging.

  7. All-codon scanning identifies p53 cancer rescue mutations

    E-Print Network [OSTI]

    2010-01-01T23:59:59.000Z

    interactions by alanine-scanning mutagenesis. Science, 244,10.1093/nar/gkq571 All-codon scanning identifies p53 cancer2010 ABSTRACT In vitro scanning mutagenesis strategies are

  8. Optical probe with reference fiber

    DOE Patents [OSTI]

    Da Silva, Luiz B. (Danville, CA); Chase, Charles L. (Dublin, CA)

    2006-03-14T23:59:59.000Z

    A system for characterizing tissue includes the steps of generating an emission signal, generating a reference signal, directing the emission signal to and from the tissue, directing the reference signal in a predetermined manner relative to the emission signal, and using the reference signal to compensate the emission signal. In one embodiment compensation is provided for fluctuations in light delivery to the tip of the probe due to cable motion.

  9. pH Meter probe assembly

    DOE Patents [OSTI]

    Hale, C.J.

    1983-11-15T23:59:59.000Z

    An assembly for mounting a pH probe in a flowing solution, such as a sanitary sewer line, which prevents the sensitive glass portion of the probe from becoming coated with grease, oil, and other contaminants, whereby the probe gives reliable pH indication over an extended period of time. The pH probe assembly utilizes a special filter media and a timed back-rinse feature for flushing clear surface contaminants of the filter. The flushing liquid is of a known pH and is utilized to check performance of the probe. 1 fig.

  10. A New Interpretation of the Scanning Tunneling Microscope Image...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Interpretation of the Scanning Tunneling Microscope Image of Graphite. A New Interpretation of the Scanning Tunneling Microscope Image of Graphite. Abstract: In this work,...

  11. CFN | Hitachi HD2700C Scanning Transmission Electron Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Hitachi HD2700C Scanning Transmission Electron Microscope Contacts: Dong Su | Lihua Zhang | Huolin Xin The Hitachi 2700C is a dedicated Scanning Transmission Electron Microscope...

  12. affecting electronically scanned: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Computer Technologies and Information Sciences Websites Summary: Middle Drive, Knoxville, TN 37996 The scanning electron microscope (SEM) has long been used-chamber scanning...

  13. Single particle microscopy with nanometer resolution

    E-Print Network [OSTI]

    Georg Jacob; Karin Groot-Berning; Sebastian Wolf; Stefan Ulm; Luc Couturier; Ulrich G. Poschinger; Ferdinand Schmidt-Kaler; Kilian Singer

    2014-05-26T23:59:59.000Z

    We experimentally demonstrate nanoscopic transmission microscopy relying on a deterministic single particle source. This increases the signal-to-noise ratio with respect to conventional microscopy methods, which employ Poissonian particle sources. We use laser-cooled ions extracted from a Paul trap, and demonstrate remote imaging of transmissive objects with a resolution of 8.6 $\\pm$ 2.0nm and a minimum two-sample deviation of the beam position of 1.5nm. Detector dark counts can be suppressed by 6 orders of magnitudes through gating by the extraction event. The deterministic nature of our source enables an information-gain driven approach to imaging. We demonstrate this by performing efficient beam characterization based on a Bayes experiment design method.

  14. Frontiers of in situ electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01T23:59:59.000Z

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by inmore »this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.« less

  15. Dark Field Microscopy for Analytical Laboratory Courses

    SciTech Connect (OSTI)

    Augspurger, Ashley E.; Stender, Anthony S.; Marchuk, Kyle; Greenbowe, Thomas J.; Fang, Ning

    2014-06-10T23:59:59.000Z

    An innovative and inexpensive optical microscopy experiment for a quantitative analysis or an instrumental analysis chemistry course is described. The students have hands-on experience with a dark field microscope and investigate the wavelength dependence of localized surface plasmon resonance in gold and silver nanoparticles. Students also observe and measure individual crystal growth during a replacement reaction between copper and silver nitrate. The experiment allows for quantitative, qualitative, and image data analyses for undergraduate students.

  16. Probes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level:Energy: Grid Integration Redefining What's Possible forPortsmouth/Paducah47,193.70 Hg Mercury 35 Br Bromine 43 cPoints ofJanoschek

  17. The development of optical microscopy techniques for the advancement of single-particle studies

    SciTech Connect (OSTI)

    Marchuk, Kyle

    2013-05-15T23:59:59.000Z

    Single particle orientation and rotational tracking (SPORT) has recently become a powerful optical microscopy tool that can expose many molecular motions. Unfortunately, there is not yet a single microscopy technique that can decipher all particle motions in all environmental conditions, thus there are limitations to current technologies. Within, the two powerful microscopy tools of total internal reflection and interferometry are advanced to determine the position, orientation, and optical properties of metallic nanoparticles in a variety of environments. Total internal reflection is an optical phenomenon that has been applied to microscopy to produce either fluorescent or scattered light. The non-invasive far-field imaging technique is coupled with a near-field illumination scheme that allows for better axial resolution than confocal microscopy and epi-fluorescence microscopy. By controlling the incident illumination angle using total internal reflection fluorescence (TIRF) microscopy, a new type of imaging probe called “non-blinking” quantum dots (NBQDs) were super-localized in the axial direction to sub-10-nm precision. These particles were also used to study the rotational motion of microtubules being propelled by the motor protein kinesin across the substrate surface. The same instrument was modified to function under total internal reflection scattering (TIRS) microscopy to study metallic anisotropic nanoparticles and their dynamic interactions with synthetic lipid bilayers. Utilizing two illumination lasers with opposite polarization directions at wavelengths corresponding to the short and long axis surface plasmon resonance (SPR) of the nanoparticles, both the in-plane and out-of-plane movements of many particles could be tracked simultaneously. When combined with Gaussian point spread function (PSF) fitting for particle super-localization, the binding status and rotational movement could be resolved without degeneracy. TIRS microscopy was also used to find the 3D orientation of stationary metallic anisotropic nanoparticles utilizing only long-axis SPR enhancement. The polarization direction of the illuminating light was rotated causing the relative intensity of p-polarized and s-polarized light within the evanescent field to change. The interaction of the evanescent field with the particles is dependent on the orientation of the particle producing an intensity curve. This curve and the in-plane angle can be compared with simulations to accurately determine the 3D orientation. Differential interference contrast (DIC) microscopy is another non-invasive far-field technique based upon interferometry that does not rely on staining or other contrast enhancing techniques. In addition, high numerical aperture condensers and objectives can be used to give a very narrow depth of field allowing for the optical tomography of samples, which makes it an ideal candidate to study biological systems. DIC microscopy has also proven itself in determining the orientation of gold nanorods in both engineered environments and within cells. Many types of nanoparticles and nanostructures have been synthesized using lithographic techniques on silicon wafer substrates. Traditionally, reflective mode DIC microscopes have been developed and applied to the topographical study of reflective substrates and the imaging of chips on silicon wafers. Herein, a laser-illuminated reflected-mode DIC was developed for studying nanoparticles on reflective surfaces.

  18. Quantitative imaging of living cells by deep ultraviolet microscopy

    E-Print Network [OSTI]

    Zeskind, Benjamin J

    2006-01-01T23:59:59.000Z

    Developments in light microscopy over the past three centuries have opened new windows into cell structure and function, yet many questions remain unanswered by current imaging approaches. Deep ultraviolet microscopy ...

  19. New Developments in Transmission Electron Microscopy for Nanotechnology**

    E-Print Network [OSTI]

    Wang, Zhong L.

    New Developments in Transmission Electron Microscopy for Nanotechnology** By Zhong Lin Wang* 1. Electron Microscopy and Nanotechnology Nanotechnology, as an international initiative for science manufacturing are the foundation of nanotechnology. Tracking the historical background of why nanotechnology

  20. Thin Film Morphology Control by Mechanical, Electronic and Chemical Interactions: a Scanning Tunneling Microscopy and Photoelectron Spectroscopy Study

    E-Print Network [OSTI]

    Sun, Dezheng

    2012-01-01T23:59:59.000Z

    of the formation of Anthraquinone self-assembled honeycombsizes are the same. Anthraquinone (AQ) molecules adsorb on

  1. An Scanning Tunneling Microscopy and Photoelectron Spectroscopy Study of Pattern Formation and Molecule Ordering under a Variety of Interactions

    E-Print Network [OSTI]

    Zhu, Yeming

    2013-01-01T23:59:59.000Z

    CO Molecules inside an Anthraquinone comb Network on Cu(111)CO Molecules inside an Anthraquinone Honey- comb Network onformed by deposition of anthraquinone according to Ref. [42

  2. Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis

    E-Print Network [OSTI]

    Rau, Carl

    in the areas of ultrahigh density magnetic recording, MRAM design, and miniaturized magnetic sensor arrays, it is found that rectangular Co bars of sizes between 10­30 m exhibit S type, whereas circular shaped magnetic elements show C type micromagnetic magnetization patterns. It is shown that SIMPA provides a simple way

  3. Adhesion of Rice Flour-Based Batter to Chicken Drumsticks Evaluated by Laser Scanning Confocal Microscopy and Texture Analysis

    E-Print Network [OSTI]

    societies such as the United States (Shukla, 1993). The per capita consumption of battered and breaded foods consumption of rice and rice products, rice flour is a logical alternative for wheat flour in traditional of formulated batters and breadings is about 52 × 107 kg. The consumption of battered and breaded products

  4. An Scanning Tunneling Microscopy and Photoelectron Spectroscopy Study of Pattern Formation and Molecule Ordering under a Variety of Interactions

    E-Print Network [OSTI]

    Zhu, Yeming

    2013-01-01T23:59:59.000Z

    Kim, D. , Sun, D. , Lu, W. , Cheng, Z. , Zhu, Y. , Le, D. ,Kim, D.H. , Sun, D. , Cheng, Z. , Berland, K. , Kim, Y.S. ,11, 2944 (2011) [6] Cheng Z. , Chu E. , Sun, D. , Kim D. ,

  5. Thin Film Morphology Control by Mechanical, Electronic and Chemical Interactions: a Scanning Tunneling Microscopy and Photoelectron Spectroscopy Study

    E-Print Network [OSTI]

    Sun, Dezheng

    2012-01-01T23:59:59.000Z

    Y. , Luo M. , Wyrick J. , Cheng Z. , Einstein T.L. , Rahman63 (2001) (11), p. 115415. 2. Z. Cheng, E.S. Chu, D. Sun, D.Lu, Y. Zhu, M. Luo, J. Wyrick, Z. Cheng, T.L. Einstein, T.S.

  6. Chemical imaging at 30 nm spatial resolution in 2-d and 3-d with Scanning Transmission X-ray Microscopy

    E-Print Network [OSTI]

    Fisher, Frank

    sensitive imaging of environmental biofilms; speciation and quantitative mapping of metals in natural river in January 1997, after serving on the editorial board since 1986. He has worked with AFCC since 2008 on fuel

  7. Compositional variations in strain-compensated InGaAsP/InAsP superlattices studied by scanning tunneling microscopy

    E-Print Network [OSTI]

    Feenstra, Randall

    structures fabricated by this method. Structures utilizing tensile In- GaP barriers have previously been to eight periods, the high bandgap of InGaP affects the hole transport in the MQW, resulting in an uneven a reduced material quality compared to the structures with InGaP barriers but the device performance

  8. Novel Contrast Mechanism in Cross-Sectional Scanning Tunneling Microscopy of GaSb/GaAs Type-II Nanostructures

    E-Print Network [OSTI]

    Feenstra, Randall

    very interesting both for fundamental physics23 and applications as e.g. charge storage devices24-II Nanostructures R. Timm,1, R. M. Feenstra,2 H. Eisele,1 A. Lenz,1 L. Ivanova,1 E. Lenz,3 and M. D¨ahne1 1, sharply defined contrast of the nanostructure at negative sample bias, but a smoothly broadened contrast

  9. Scanning Tunneling Microscopy and Surface Simulation of Zinc-Blende GaN(001) Intrinsic 4 Reconstruction: Linear Gallium Tetramers?

    E-Print Network [OSTI]

    Reconstruction: Linear Gallium Tetramers? Hamad A. AL-Brithen, Rong Yang, Muhammad B. Haider, Costel Constantin and occupied states, in agreement with surface simulations based on the 4 1 linear tetramer model the existence of linear Ga tetramers. DOI: PACS numbers: 68.35.Bs, 68.37.Ef, 73.20.At Based on both fundamental

  10. HIGH RESOLUTION SCANNING AUGER MICROANALYSIS OF HIGH-STRENGTH SILICON CARBIDES

    E-Print Network [OSTI]

    Krivanek, O.L.

    2012-01-01T23:59:59.000Z

    Society HIGH RESOLUTION SCANNING AUGER MICROANALYSIS OFCalifornia. HIGH RESOLUTION SCANNING AUGER MICROANALYSIS OFhelium, by high resolution scanning Auger microanalysis and

  11. Apparatus for controlling the scan width of a scanning laser beam

    DOE Patents [OSTI]

    Johnson, Gary W. (Livermore, CA)

    1996-01-01T23:59:59.000Z

    Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board.

  12. Apparatus for controlling the scan width of a scanning laser beam

    DOE Patents [OSTI]

    Johnson, G.W.

    1996-10-22T23:59:59.000Z

    Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board. 8 figs.

  13. Scanning and storage of electrophoretic records

    DOE Patents [OSTI]

    McKean, Ronald A. (Royal Oak, MI); Stiegman, Jeff (Ann Arbor, MI)

    1990-01-01T23:59:59.000Z

    An electrophoretic record that includes at least one gel separation is mounted for motion laterally of the separation record. A light source is positioned to illuminate at least a portion of the record, and a linear array camera is positioned to have a field of view of the illuminated portion of the record and orthogonal to the direction of record motion. The elements of the linear array are scanned at increments of motion of the record across the field of view to develop a series of signals corresponding to intensity of light at each element at each scan increment.

  14. Chemically-selective imaging of brain structures with CARS microscopy

    E-Print Network [OSTI]

    Xie, Xiaoliang Sunney

    Chemically-selective imaging of brain structures with CARS microscopy Conor L. Evans1§ , Xiaoyin Xu anti-Stokes Raman scattering (CARS) microscopy to image brain structure and pathology ex vivo. Although. Definitive diagnosis still requires brain biopsy in a significant number of cases. CARS microscopy

  15. Time-stretch microscopy based on time-wavelength sequence reconstruction from wideband incoherent source

    SciTech Connect (OSTI)

    Zhang, Chi, E-mail: chizheung@gmail.com; Xu, Yiqing; Wei, Xiaoming; Tsia, Kevin K.; Wong, Kenneth K. Y., E-mail: kywong@eee.hku.hk [Photonic Systems Research Laboratory, Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road (Hong Kong)

    2014-07-28T23:59:59.000Z

    Time-stretch microscopy has emerged as an ultrafast optical imaging concept offering the unprecedented combination of the imaging speed and sensitivity. However, dedicated wideband and coherence optical pulse source with high shot-to-shot stability has been mandated for time-wavelength mapping—the enabling process for ultrahigh speed wavelength-encoded image retrieval. From the practical point of view, exploiting methods to relax the stringent requirements (e.g., temporal stability and coherence) for the source of time-stretch microscopy is thus of great value. In this paper, we demonstrated time-stretch microscopy by reconstructing the time-wavelength mapping sequence from a wideband incoherent source. Utilizing the time-lens focusing mechanism mediated by a narrow-band pulse source, this approach allows generation of a wideband incoherent source, with the spectral efficiency enhanced by a factor of 18. As a proof-of-principle demonstration, time-stretch imaging with the scan rate as high as MHz and diffraction-limited resolution is achieved based on the wideband incoherent source. We note that the concept of time-wavelength sequence reconstruction from wideband incoherent source can also be generalized to any high-speed optical real-time measurements, where wavelength is acted as the information carrier.

  16. Importance-Scanning Worm Using Vulnerable-Host Distribution

    E-Print Network [OSTI]

    Ji, Chuanyi

    Importance-Scanning Worm Using Vulnerable-Host Distribution Zesheng Chen School of Electrical scanning. The distribution of vulnerable hosts on the Internet, however, is highly non- uniform over the IP-address space. This implies that random scanning wastes many scans on invulnerable addresses, and more virulent

  17. A new screen scanning system based on clustering screen objects

    E-Print Network [OSTI]

    Robinson, Peter

    A new screen scanning system based on clustering screen objects Pradipta Biswas Research Student with a computer through one or two switches with the help of a scanning mechanism. In this paper we present a new scanning technique based on clustering screen objects and then compare it with two other scanning systems

  18. Simultaneous Operation of Multiple Collocated Radios and the Scanning Problem

    E-Print Network [OSTI]

    Barbeau, Michel

    Simultaneous Operation of Multiple Collocated Radios and the Scanning Problem Michel Barbeau. The radio interface scans channels to uncover beacons periodically sent by transmitters. The goal of the scanning activity is to uncover the beacons within the shortest possible time. We call this the scanning

  19. Universal Scanning and Sequential Decision Making for Multidimensional Data

    E-Print Network [OSTI]

    Weissman, Tsachy

    Universal Scanning and Sequential Decision Making for Multidimensional Data Asaf Cohen Department in scanning of multidimensional data arrays, such as universal scanning and prediction ("scandiction, it is natural to ask what is the optimal method to scan and predict a given image, what is the resulting minimum

  20. Imaging doped silicon test structures using low energy electron microscopy.

    SciTech Connect (OSTI)

    Nakakura, Craig Yoshimi; Anderson, Meredith Lynn; Kellogg, Gary Lee

    2010-01-01T23:59:59.000Z

    This document is the final SAND Report for the LDRD Project 105877 - 'Novel Diagnostic for Advanced Measurements of Semiconductor Devices Exposed to Adverse Environments' - funded through the Nanoscience to Microsystems investment area. Along with the continuous decrease in the feature size of semiconductor device structures comes a growing need for inspection tools with high spatial resolution and high sample throughput. Ideally, such tools should be able to characterize both the surface morphology and local conductivity associated with the structures. The imaging capabilities and wide availability of scanning electron microscopes (SEMs) make them an obvious choice for imaging device structures. Dopant contrast from pn junctions using secondary electrons in the SEM was first reported in 1967 and more recently starting in the mid-1990s. However, the serial acquisition process associated with scanning techniques places limits on the sample throughput. Significantly improved throughput is possible with the use of a parallel imaging scheme such as that found in photoelectron emission microscopy (PEEM) and low energy electron microscopy (LEEM). The application of PEEM and LEEM to device structures relies on contrast mechanisms that distinguish differences in dopant type and concentration. Interestingly, one of the first applications of PEEM was a study of the doping of semiconductors, which showed that the PEEM contrast was very sensitive to the doping level and that dopant concentrations as low as 10{sup 16} cm{sup -3} could be detected. More recent PEEM investigations of Schottky contacts were reported in the late 1990s by Giesen et al., followed by a series of papers in the early 2000s addressing doping contrast in PEEM by Ballarotto and co-workers and Frank and co-workers. In contrast to PEEM, comparatively little has been done to identify contrast mechanisms and assess the capabilities of LEEM for imaging semiconductor device strictures. The one exception is the work of Mankos et al., who evaluated the impact of high-throughput requirements on the LEEM designs and demonstrated new applications of imaging modes with a tilted electron beam. To assess its potential as a semiconductor device imaging tool and to identify contrast mechanisms, we used LEEM to investigate doped Si test structures. In section 2, Imaging Oxide-Covered Doped Si Structures Using LEEM, we show that the LEEM technique is able to provide reasonably high contrast images across lateral pn junctions. The observed contrast is attributed to a work function difference ({Delta}{phi}) between the p- and n-type regions. However, because the doped regions were buried under a thermal oxide ({approx}3.5 nm thick), e-beam charging during imaging prevented quantitative measurements of {Delta}{phi}. As part of this project, we also investigated a series of similar test structures in which the thermal oxide was removed by a chemical etch. With the oxide removed, we obtained intensity-versus-voltage (I-V) curves through the transition from mirror to LEEM mode and determined the relative positions of the vacuum cutoffs for the differently doped regions. Although the details are not discussed in this report, the relative position in voltage of the vacuum cutoffs are a direct measure of the work function difference ({Delta}{phi}) between the p- and n-doped regions.

  1. Entangled quantum probes for dynamical environmental noise

    E-Print Network [OSTI]

    Matteo A. C. Rossi; Matteo G. A. Paris

    2015-03-11T23:59:59.000Z

    We address the use of entangled qubits as quantum probes to characterize the dynamical noise induced by complex environments. In particular, we show that entangled probes improve estimation of the correlation time for a broad class of environmental noises compared to any sequential strategy involving single qubit preparation. The effect is present when the noise is faster than a threshold value, a regime which may always be achieved by tuning the coupling between the quantum probe and the environment inducing the noise. Our scheme exploits time-dependent sensitivity of quantum systems to decoherence and does not require dynamical control on the probes. We derive the optimal interaction time and the optimal probe preparation, showing that it corresponds to multiqubit GHZ states when entanglement is useful. We also show robustness of the scheme against depolarization or dephasing of the probe, and discuss simple measurements approaching optimal precision.

  2. PNNL SA 95506 Scan to learn more

    E-Print Network [OSTI]

    PNNL SA 95506 Scan to learn more www.pnnl.gov At Pacific Northwest National Laboratory, we are transforming the world through courageous discovery and innovation. The evidence is all around us. PNNL called PNNL) developed the standards and devices for setting and measuring radiation doses received

  3. Department of Transportation I. Internal Scan

    E-Print Network [OSTI]

    Tipple, Brett

    Department of Transportation I. Internal Scan The number of older drivers in the United States-driver basis, older adults are among the safest. The average annual number of crashes in the United States million vehicle miles traveled (MVMT), drivers over the age of 75 have a fatality rate of 3.7 deaths per

  4. Department of Health I. Internal Scan

    E-Print Network [OSTI]

    Tipple, Brett

    and cholesterol; and working with consumers, health plans and providers to improve the quality of care and other non- institutional settings. CURRRENT PLANS: The Division of Health care Financing has been takingDepartment of Health I. Internal Scan There are a variety of areas that will be impacted

  5. INNOVATIVE EDDY CURRENT PROBE FOR MICRO DEFECTS

    SciTech Connect (OSTI)

    Santos, Telmo G.; Vilaca, Pedro; Quintino, Luisa [IDMEC, Av. Rovisco Pais, 1049-001 Lisbon (Portugal); Santos, Jorge dos [GKSS, Max-Planck-Street 1, D-21502 Geesthacht (Germany); Rosado, Luis [IST, UTL, Av. Rovisco Pais, 1049-001 Lisbon (Portugal)

    2010-02-22T23:59:59.000Z

    This paper reports the development of an innovative eddy current (EC) probe, and its application to micro-defects on the root of the Friction Stir Welding (FSW). The new EC probe presents innovative concept issues, allowing 3D induced current in the material, and a lift-off independence. Validation experiments were performed on aluminium alloys processed by FSW. The results clearly show that the new EC probe is able to detect and sizing surface defects about 60 microns depth.

  6. Continuous motion scan ptychography: Characterization for increased speed in coherent x-ray imaging

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Deng, Junjing; Nashed, Youssef S. G.; Chen, Si; Phillips, Nicholas W.; Peterka, Tom; Ross, Rob; Vogt, Stefan; Jacobsen, Chris; Vine, David J.

    2015-01-01T23:59:59.000Z

    Ptychography is a coherent diffraction imaging (CDI) method for extended objects in which diffraction patterns are acquired sequentially from overlapping coherent illumination spots. The object’s complex transmission function can be reconstructed from those diffraction patterns at a spatial resolution limited only by the scattering strength of the object and the detector geometry. Most experiments to date have positioned the illumination spots on the sample using a move-settle-measure sequence in which the move and settle steps can take longer to complete than the measure step. We describe here the use of a continuous “fly-scan” mode for ptychographic data collection in whichmore »the sample is moved continuously, so that the experiment resembles one of integrating the diffraction patterns from multiple probe positions. This allows one to use multiple probe mode reconstruction methods to obtain an image of the object and also of the illumination function. We show in simulations, and in x-ray imaging experiments, some of the characteristics of fly-scan ptychography, including a factor of 25 reduction in the data acquisition time. This approach will become increasingly important as brighter x-ray sources are developed, such as diffraction limited storage rings.« less

  7. Fast electron microscopy via compressive sensing

    DOE Patents [OSTI]

    Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

    2014-12-09T23:59:59.000Z

    Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

  8. New Microscopy Patent Awarded | The Ames Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOE Office of Science (SC)Integrated CodesTransparency VisitSilverNephelineNeuralNewIdeasofNew Microscopy Patent

  9. PROBING DENSE NUCLEAR MATTER VIA NUCLEAR COLLISIONS

    E-Print Network [OSTI]

    Stocker, H.

    2012-01-01T23:59:59.000Z

    University of California. LBL-12095 Probing Dense NuclearMatter Nuclear Collisions* v~a H. Stocker, M.Gyulassy and J. Boguta Nuclear Science Division Lawrence

  10. OPTICAL BIOPSY: COMPLEMENTING HISTOLOGY WITH NONLINEAR OPTICAL MICROSCOPY

    E-Print Network [OSTI]

    Shafer, Christina

    2006-08-16T23:59:59.000Z

    acquisition from 32 detectors. The initial task competed involved the scanning mechanism; a program was created to control motorized optical scanning mirrors. The next task required a circuit board to be built to interface the detectors with the computer. A...

  11. Synchrotron radiation induced x-ray micro analysis: A realistic alternative for electron- and ion beam microscopy?

    SciTech Connect (OSTI)

    Janssens, K.; Adams, F. [Universitaire Instelling Antwerpen, Antwerp (Belgium). Dept. of Chemistry; Rivers, M.L.; Jones, K.W. [Brookhaven National Lab., Upton, NY (United States)

    1992-10-01T23:59:59.000Z

    Synchrotron Radiation induced X-ray micro Fluorescence analysis ({mu}-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed.

  12. Synchrotron radiation induced x-ray micro analysis: A realistic alternative for electron- and ion beam microscopy

    SciTech Connect (OSTI)

    Janssens, K.; Adams, F. (Universitaire Instelling Antwerpen, Antwerp (Belgium). Dept. of Chemistry); Rivers, M.L.; Jones, K.W. (Brookhaven National Lab., Upton, NY (United States))

    1992-01-01T23:59:59.000Z

    Synchrotron Radiation induced X-ray micro Fluorescence analysis ([mu]-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed.

  13. Local tunneling characteristics near a grain boundary of a d-wave superconductor as probed by a normal-metal or a low-Tc-superconductor STM tip

    E-Print Network [OSTI]

    Zhao, Hongwei

    2005-08-29T23:59:59.000Z

    We studied the local single-particle tunneling characteristics [as observed with scanning tunnel microscopy (STM)] for N D and S D tunneling, where N is a normal metal, S is a s-wave superconductor, and D is a d-wave superconductor with a {100...

  14. MERIT Pump/Probe Data OutlineOutline

    E-Print Network [OSTI]

    McDonald, Kirk

    MERIT Pump/Probe Data Analysis OutlineOutline The pump/probe program Particle detector response correction Pump/probe analysis results NFMCC Collaboration Meeting , LBNL, January 26, 2009 Ilias Efthymiopoulos - CERN #12;The pump/probe program #12;The pump/probe program Use of the CERN PS flexibility

  15. In-situ spectrophotometric probe

    DOE Patents [OSTI]

    Prather, W.S.

    1992-12-15T23:59:59.000Z

    A spectrophotometric probe is described for in situ absorption spectra measurements comprising a first optical fiber carrying light from a remote light source, a second optical fiber carrying light to a remote spectrophotometer, the proximal ends of the first and second optical fibers parallel and co-terminal, a planoconvex lens to collimate light from the first optical fiber, a reflecting grid positioned a short distance from the lens to reflect the collimated light back to the lens for focusing on the second optical fiber. The lens is positioned with the convex side toward the optical fibers. A substrate for absorbing analyte or an analyte and reagent mixture may be positioned between the lens and the reflecting grid. 5 figs.

  16. Millimeter-wave active probe

    DOE Patents [OSTI]

    Majidi-Ahy, Gholamreza (Sunnyvale, CA); Bloom, David M. (Portola Valley, CA)

    1991-01-01T23:59:59.000Z

    A millimeter-wave active probe for use in injecting signals with frequencies above 50GHz to millimeter-wave and ultrafast devices and integrated circuits including a substrate upon which a frequency multiplier consisting of filter sections and impedance matching sections are fabricated in uniplanar transmission line format. A coaxial input and uniplanar 50 ohm transmission line couple an approximately 20 GHz input signal to a low pass filter which rolls off at approximately 25 GHz. An input impedance matching section couples the energy from the low pass filter to a pair of matched, antiparallel beam lead diodes. These diodes generate odd-numberd harmonics which are coupled out of the diodes by an output impedance matching network and bandpass filter which suppresses the fundamental and third harmonics and selects the fifth harmonic for presentation at an output.

  17. Laser scanning system for object monitoring

    DOE Patents [OSTI]

    McIntyre, Timothy James [Knoxville, TN; Maxey, Lonnie Curtis [Powell, TN; Chiaro, Jr; John, Peter [Clinton, TN

    2008-04-22T23:59:59.000Z

    A laser scanner is located in a fixed position to have line-of-sight access to key features of monitored objects. The scanner rapidly scans pre-programmed points corresponding to the positions of retroreflecting targets affixed to the key features of the objects. The scanner is capable of making highly detailed scans of any portion of the field of view, permitting the exact location and identity of targets to be confirmed. The security of an object is verified by determining that the cooperative target is still present and that its position has not changed. The retroreflecting targets also modulate the reflected light for purposes of returning additional information back to the location of the scanner.

  18. Macroscopic model of scanning force microscope

    DOE Patents [OSTI]

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05T23:59:59.000Z

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  19. Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint

    SciTech Connect (OSTI)

    Gorman, B. P.; Guthrey, H.; Norman, A. G.; Al-Jassim, M.; Lawrence, D.; Prosa, T.

    2011-07-01T23:59:59.000Z

    Internal interfaces are critical in determining the performance of III-V multijunction solar cells. Studying these interfaces with atomic resolution using a combination of transmission electron microscopy (TEM), atom probe tomography (APT), and density functional calculations enables a more fundamental understanding of carrier dynamics in photovoltaic (PV) device structures. To achieve full atomic scale spatial and chemical resolution, data acquisition parameters in laser pulsed APT must be carefully studied to eliminate surface diffusion. Atom probe data with minimized group V ion clustering and expected stoichiometry can be achieved by adjusting laser pulse power, pulse repetition rate, and specimen preparation parameters such that heat flow away from the evaporating surface is maximized. Applying these improved analysis conditions to III-V based PV gives an atomic scale understanding of compositional and dopant profiles across interfaces and tunnel junctions and the initial stages of alloy clustering and dopant accumulation. Details on APT experimental methods and future in-situ instrumentation developments are illustrated.

  20. Systematic Sampling of Scanning Lidar Swaths

    E-Print Network [OSTI]

    Marcell, Wesley Tyler

    2011-02-22T23:59:59.000Z

    of the requirements for the degree of MASTER OF SCIENCE Approved by: Co-Chairs of Committee, Marian Eriksson Sorin Pospescu Committee Members, Cristine Morgan Ross Nelson Head of Department, Steven Whisenant December 2009 Major Subject: Forestry... iii ABSTRACT Systematic Sampling of Scanning Lidar Swaths. (December 2009) Wesley Tyler Marcell, B.S., Texas A&M University Co-Chairs of Advisory Committee: Dr. Marian Eriksson Dr. Sorin...