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Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


1

Batch fabrication of cantilever array aperture probes for scanning near-field optical microscopy  

Science Conference Proceedings (OSTI)

We have developed a novel batch fabrication process for cantilever array aperture probes used in scanning near-field optical microscopy (SNOM). The array probes, consisting of 16 parallel cantilevers with each tip having an identical aperture, are proposed ... Keywords: Cantilever probes, Nanofabrication, Scanning near-field optical microscopy (SNOM)

Y. Zhang; K. E. Docherty; J. M. R. Weaver

2010-05-01T23:59:59.000Z

2

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene  

E-Print Network (OSTI)

We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the energy transfer distance dependence of 14 the nitrogen-vacancy center to graphene was measured to show the predicted d-4 15 dependence. Our studies pave the way towards a diamond defect center based versatile 16 single emitter scanning microscope.

J. Tisler; T. Oeckinghaus; R. Stöhr; R. Kolesov; F. Reinhard; J. Wrachtrup

2013-01-02T23:59:59.000Z

3

Near-Field Microscopy Through a SiC Superlens  

E-Print Network (OSTI)

Near-Field Microscopy Through a SiC Superlens Thomas Taubner,1 * Dmitriy Korobkin,2 Yaroslav of the slab (4­6). In our experiment, we placed a SiC superlens (7) between the scan- ning probe tip-crystalline SiC membrane coated on both sides with 220-nm-thick SiO2 layers (7). The two surfaces of the sandwich

Shvets, Gennady

4

Scanning tip microwave near field microscope  

SciTech Connect

A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

Xiang, Xiao-Dong (Alameda, CA); Schultz, Peter G. (Oakland, CA); Wei, Tao (Albany, CA)

1998-01-01T23:59:59.000Z

5

Near-field Microwave Scanning Probe Imaging of Conductivity Inhomogeneities in CVD Graphene  

SciTech Connect

We have performed near-field scanning microwave microscopy (SMM) of graphene grown by chemical vapor deposition. Due to the use of probe-sample capacitive coupling and a relatively high ac frequency of a few GHz, this scanning probe method allows mapping of local conductivity without a dedicated counter electrode, with a spatial resolution of about 50 nm. Here, the coupling was enabled by atomic layer deposition of alumina on top of graphene, which in turn enabled imaging both large-area films, as well as micron-sized islands, with a dynamic range covering a low sheet resistance of a metal film and a high resistance of highly disordered graphene. The structures of graphene grown on Ni films and Cu foils are explored, and the effects of growth conditions are elucidated. We present a simple general scheme for interpretation of the contrast in the SMM images of our graphene samples and other two-dimensional conductors, which is supported by extensive numerical finite-element modeling. We further demonstrate that combination of the SMM and numerical modeling allows quantitative information about the sheet resistance of graphene to be obtained, paving the pathway for characterization of graphene conductivity with a sub-100 nm special resolution.

Tselev, Alexander [ORNL; Lavrik, Nickolay V [ORNL; Vlassiouk, Ivan V [ORNL; Briggs, Dayrl P [ORNL; Rutgers, Maarten [Asylum Research, Santa Barbara, CA; Proksch, Roger [Asylum Research, Santa Barbara, CA; Kalinin, Sergei V [ORNL

2012-01-01T23:59:59.000Z

6

Ultrafast scanning probe microscopy  

DOE Patents (OSTI)

An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.

Weiss, Shimon (El Cerrito, CA); Chemla, Daniel S. (Kensington, CA); Ogletree, D. Frank (El Cerrito, CA); Botkin, David (San Francisco, CA)

1995-01-01T23:59:59.000Z

7

Ultrafast scanning probe microscopy  

DOE Patents (OSTI)

An ultrafast scanning probe microscopy method is described for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample. 6 Figs.

Weiss, S.; Chemla, D.S.; Ogletree, D.F.; Botkin, D.

1995-05-16T23:59:59.000Z

8

Scanning Probe Microscopy with Spectroscopic Molecular ...  

ORNL researchers developed an innovative imaging method that possesses the imaging capability of scanning near-field ultrasound holography and the che ...

9

Scanning Electron Microscopy (SEM)  

Science Conference Proceedings (OSTI)

...The scanning electron microscope provides a valuable combination of high resolution imaging, elemental analysis, and recently, crystallographic analysis: Imaging of features as small as sim 10 nm or less, roughly 100 times smaller than can be seen with...

10

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

Publications | SXSPM Related Book Chapters V. Rose, J.W. Freeland, S.K. Streiffer, "New Capabilities at the Interface of X-rays and Scanning Tunneling Microscopy", in Scanning...

11

Neural network characterization of scanning electron microscopy  

Science Conference Proceedings (OSTI)

A scanning electron microscope (SEM) is a sophisticated equipment employed for fine imaging of processed film surfaces. In this study, a prediction model of scanning electron microscopy was constructed by using a generalized regression neural network ... Keywords: generalized regression neural network, genetic algorithm, model, scanning electron microscope, statistical experiment

Sanghee Kwon; Donghwan Kim; Byungwhan Kim

2008-07-01T23:59:59.000Z

12

Scanning Transmission Electron Microscopy Investigations of Complex...  

NLE Websites -- All DOE Office Websites (Extended Search)

Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of...

13

Scanning probe microscopy in the superconductor industry  

SciTech Connect

High-temperature superconductivity and scanning probe microscopy (SPM) have much in common. Both revolutionized their scientific fields and earned Nobel prizes for the original researchers. Both represent small-scale table-top research. Finally, both have emerged from research laboratories into growing industries. Applications of scanning probe microscopy to the superconductor industry range from the straightforward to the exotic. The superior three-dimensional resolution of scanning probe microscopes makes them ideal for routine topographic imaging and profilometry of substrates and thin films. On the other hand, the more esoteric applications of SPM include spectroscopic investigations of various electromagnetic properties of superconductors above and below the critical temperature.

Howland, R.S.; Kirk, M.D. (Park Scientific Instruments (US))

1991-01-01T23:59:59.000Z

14

Spatially-Resolved Studies of Grain-Boundary Effects in Polycrystalline Solar Cells Using Micro-Photoluminescence and Near-Field Microscopy  

DOE Green Energy (OSTI)

Photoluminescence and photocurrent spectroscopies combined with diffraction-limited and sub- diffraction-limited spatial resolution are achieved via micro-photoluminescence (m-PL) and near-field microscopy (NSOM). These methods are used to examine the photo-response of individual grain boundaries in thin-film, polycrystalline solar cells at room and cryogenic temperatures. A systematic m-PL study of the effect of CdCl2-treatment on recombination in CdTe/CdS solar cell structures of varying thickness directly reveals the grain-boundary and surface passivation action of this important post-growth processing step. We achieve 50nm (l/10) spatial resolution in near-field Optical Beam Induced Current imaging (n-OBIC) of polycrystalline silicon solar cells using NSOM, at varying stages of silicon nitride grain-boundary passivation, and measure lateral variations in photo-response of CdTe/CdS solar cells with subwavelength spatial resolution.

Smith, S.; Dhere, R.; Gessert, T.; Stradins, P.; Mascarenhas, A.

2005-01-01T23:59:59.000Z

15

Scanning magnetoresistance microscopy of atom chips  

Science Conference Proceedings (OSTI)

Surface based geometries of microfabricated wires or patterned magnetic films can be used to magnetically trap and manipulate ultracold neutral atoms or Bose-Einstein condensates. We investigate the magnetic properties of such atom chips using a scanning magnetoresistive (MR) microscope with high spatial resolution and high field sensitivity. By comparing MR scans of a permanent magnetic atom chip to field profiles obtained using ultracold atoms, we show that MR sensors are ideally suited to observe small variations of the magnetic field caused by imperfections in the wires or magnetic materials which ultimately lead to fragmentation of ultracold atom clouds. Measurements are also provided for the magnetic field produced by a thin current-carrying wire with small geometric modulations along the edge. Comparisons of our measurements with a full numeric calculation of the current flow in the wire and the subsequent magnetic field show excellent agreement. Our results highlight the use of scanning MR microscopy as a convenient and powerful technique for precisely characterizing the magnetic fields produced near the surface of atom chips.

Volk, M.; Whitlock, S.; Wolff, C. H.; Hall, B. V.; Sidorov, A. I. [ARC Centre of Excellence for Quantum-Atom Optics and Centre for Atom Optics and Ultrafast Spectroscopy, Swinburne University of Technology, Hawthorn, Victoria 3122 (Australia)

2008-02-15T23:59:59.000Z

16

Imaging Small Molecules by Scanning Probe Microscopy Shirley Chiang  

E-Print Network (OSTI)

1 Imaging Small Molecules by Scanning Probe Microscopy Shirley Chiang Department of Physics. Ohtani, R.J. Wilson, S. Chiang, and C.M. Mate, "Scanning Tunneling Microscopy Observations of Benzene. V.M. Hallmark, S. Chiang, J.F. Rabolt, J.D. Swalen, and R.J. Wilson, "Observation of Atomic

Chiang, Shirley

17

Nonlocal, grating-coupled scattering-type near-field scanning optical microscopy of individual gold nano-particles  

E-Print Network (OSTI)

nano-particles D. Sadiq, J. Shirdel*, and C. Lienau Institut für Physik, Carl von Ossietzky Universität nano-particles. We demonstrate sub-30-nm-resolution imaging of localized SPP fields. By comparison onto a photodetector. When imaging small individual gold nano-particles with

Park, Namkyoo

18

Atmospheric pressure scanning transmission electron microscopy  

SciTech Connect

Scanning transmission electron microscope (STEM) images of gold nanoparticles (2.1 nm average diameter) at atmospheric pressure have been recorded through a 0.36 mm thick mixture of CO, O2 and He. This was accomplished using a reaction cell consisting of two electron-transparent silicon nitride membranes mounted on a specially designed specimen rod. Gas flow occurred through plastic tubing from the outside of the microscope to the specimen region and back. Gold nanoparticles of a full width half maximum diameter of 1.0 nm were visible above the background noise and the achieved resolution was 0.5 nm in accordance with calculations of the beam broadening.

De Jonge, Niels [ORNL; Veith, Gabriel M [ORNL; Bigelow, Wilbur C [ORNL

2010-01-01T23:59:59.000Z

19

Open Source Scanning Probe Microscopy Control Software package GXSM  

SciTech Connect

GXSM is a full featured and modern scanning probe microscopy (SPM) software. It can be used for powerful multidimensional image/data processing, analysis, and visualization. Connected to an instrument, it is operating many different flavors of SPM, e.g., scanning tunneling microscopy and atomic force microscopy or, in general, two-dimensional multichannel data acquisition instruments. The GXSM core can handle different data types, e.g., integer and floating point numbers. An easily extendable plug-in architecture provides many image analysis and manipulation functions. A digital signal processor subsystem runs the feedback loop, generates the scanning signals, and acquires the data during SPM measurements. The programmable GXSM vector probe engine performs virtually any thinkable spectroscopy and manipulation task, such as scanning tunneling spectroscopy or tip formation. The GXSM software is released under the GNU general public license and can be obtained via the internet.

Zahl, P.; Wagner, T.; Moller, R.; Klust, A.

2010-05-01T23:59:59.000Z

20

Scanning Transmission Electron Microscopy Investigations of Complex Oxides  

NLE Websites -- All DOE Office Websites (Extended Search)

Scanning Transmission Electron Microscopy Investigations of Complex Oxides Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of Chemistry, University of South Carolina High-Angle-Annular-Dark-Field/Scanning Transmission Electron Microscopy (HAADF/STEM) is a technique uniquely suited for detailed studies of the structure and composition of complex oxides. The HAADF detector collects electrons which have interact inelastically with the potentials of the atoms in the specimen and therefore resembles the better known Z2 (Z is atomic number) Rutherford scattering. One class of important catalysts consists of bronzes based on pentagonal {Mo6O21} building units; these include Mo5O14 and Mo17O47. In the last 20 years, new materials doped with

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


21

Scanning transmission electron microscopy of gate stacks with HfO2 dielectrics and TiN electrodes  

E-Print Network (OSTI)

Scanning transmission electron microscopy of gate stacksEELS) in scanning transmission electron microscopy were usedWe use scanning transmission electron microscopy (STEM)

Agustin, Melody P.; Fonseca, Leo R. C.; Hooker, Jacob C.; Stemmer, Susanne

2005-01-01T23:59:59.000Z

22

Plasmonic Field Enhancement of Individual Nanoparticles by Correlated Scanning and Photoemission Electron Microscopy  

SciTech Connect

We present results of a combined two-photon photoemission and scanning electron microscopy investigation to determine the electromagnetic enhancement factors of silver-coated spherical nanoparticles deposited on an atomically flat mica substrate. Femtosecond laser excitation, of the nanoparticles, produces intense photoemission, attributed to near-resonant excitation of localized surface plasmons. Enhancement factors are determined by comparing the respective two-photon photoemission yield measured for equal areas between single nanoparticles to that of the surrounding flat surface. For s-polarized, 400 nm (~ 3.1 eV) femtosecond radiation a distribution of enhancement factors are found with a large percentage (77%) of the nanoparticles falling within a median range. A correlated scanning electron microscopy analysis demonstrated that the nanoparticles typifying the median of the distribution were characterized by ideal spherical shapes and defect-free morphologies. The single largest enhancement factors were in contrast produced by a very small percentage (8%) of the total, for which evidence of silver defect anomalies were found that contributed to the overall structure of the nanoparticle. Comparisons are made between the experimentally measured enhancement factors and previously reported theoretical predictions of the localized surface plasmon near-field intensities for isolated nanometer-sized silver spheres.

Peppernick, Samuel J.; Joly, Alan G.; Beck, Kenneth M.; Hess, Wayne P.

2011-01-21T23:59:59.000Z

23

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

G. R. et al. Scanning transmission X-ray microscopy: A newwith the scanning transmission X-ray microscope at BESSY II.T. et al. Scanning transmission X-ray microscopy imaging of

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

24

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

27.2013 27.2013 Researchers from NSLS-II visit SXSPM team at Argonne Synchrotron x-ray scanning tunneling microscopy will soon also be developed at the National Synchrotron Light Source (NSLS-II) at Brookhaven National Laboratory (BNL). In order to establish collaboration between the two National Laboratories, Drs. Evgeny Nazaretski and Hui Yan fom BNL visited Argonne to learn more about recent progress made in the SXSPM project. During the 2-day visit the teams discussed mutual scientific goals and strategies to achieve them. NSLS-II will be a new state-of-the-art, medium-energy electron storage ring at BNL designed to deliver high intensity and brightness. Construction of the NSLS-II's ring building began in March 2009. The new facility will begin operating in 2014

25

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

APS APS SXSPM News Researchers from NSLS-II visit SXSPM team at Argonne (November 27, 2013) Cummings presents invited talk at magnetism meeting (November 11, 2013) Invited talk at ACSIN-12 & ICSPM21 in Japan (November 11, 2013) Nanoscience Seminar presented at Tokyo University (November 01, 2013) Scientists study old photos for new solutions to corrosion (October 21, 2013) More News Featured Image Recent Publications Kangkang Wang, Daniel Rosenmann, Martin Holt, Robert Winarski, Saw-Wai Hla, and Volker Rose, "An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy", Rev. Sci. Instrum. 84, 063704 (2013). More SXSPM Publications Upcoming Presentations V. Rose, 41st Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-41) (Invited Speaker)

26

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

01.2013 01.2013 Nanoscience Seminar presented at Tokyo University On November 1, 2013, Volker Rose was invited to present the Nanoscience Seminar at the Institute of Solid State Physics (ISSP) of the University of Tokyo. In his seminar he discussed the physical principles of Synchrotron X-ray Scanning Tunneling Microscopy (SXSTM) as well as the recent progress made by his team at the Advanced Photon Source. He was invited by Prof. Yukio Hasegawa, who himself conducts SXSTM experiment at the Photon Factory in Tsukuba, Japan. The ISSP serves as the central laboratory of materials science in Japan equipped with state-of-art facilities. It was relocated to the new campus in Kashiwa of the University of Tokyo in 2000 after the 43 years of activities at the Roppongi campus in downtown Tokyo. Here ISSP is focusing

27

Scanning Surface Potential Microscopy of Spore Adhesion on Surfaces  

SciTech Connect

The adhesion of spores of Bacillus anthracis - the cause of anthrax and a likely biological threat - to solid surfaces is an important consideration in cleanup after an accidental or deliberate release. However, because of safety concerns, directly studying B. anthracis spores with advanced instrumentation is problematic. As a first step, we are examining the electrostatic potential of Bacillus thuringiensis (Bt), which is a closely related species that is often used as a simulant to study B. anthracis. Scanning surface potential microscopy (SSPM), also known as Kelvin probe force microscopy (KPFM), was used to investigate the influence of relative humidity (RH) on the surface electrostatic potential of Bt that had adhered to silica, mica, or gold substrates. AFM/SSPM side-by-side images were obtained separately in air, at various values of RH, after an aqueous droplet with spores was applied on each surface and allowed to dry before measurements. In the SSPM images, a negative potential on the surface of the spores was observed compared with that of the substrates. The surface potential decreased as the humidity increased. Spores were unable to adhere to a surface with an extremely negative potential, such as mica.

Lee, Ida [University of Tennessee, Knoxville (UTK); Chung, Eunhyea [Georgia Institute of Technology; Kweon, Hyojin [Georgia Institute of Technology; Yiacoumi, Sotira [Georgia Institute of Technology; Tsouris, Costas [ORNL

2012-01-01T23:59:59.000Z

28

Scanning tunneling optical resonance microscopy applied to indium arsenide quantum dot structures.  

E-Print Network (OSTI)

??The technique of Scanning Tunneling Optical Resonance Microscopy (STORM) has been investigated for use on nanostructures. It has been demonstrated as a viable technique to… (more)

Byrnes, Daniel P.

2008-01-01T23:59:59.000Z

29

Electron and Scanning Probe Microscopies | U.S. DOE Office of Science (SC)  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron and Scanning Probe Microscopies Electron and Scanning Probe Microscopies Materials Sciences and Engineering (MSE) Division MSE Home About Research Areas Energy Frontier Research Centers (EFRCs) DOE Energy Innovation Hubs BES Funding Opportunities The Computational Materials and Chemical Sciences Network (CMCSN) Theoretical Condensed Matter Physics Scientific Highlights Reports and Activities Principal Investigators' Meetings BES Home Research Areas Electron and Scanning Probe Microscopies Print Text Size: A A A RSS Feeds FeedbackShare Page This research area supports basic research in condensed matter physics and materials physics using electron scattering and microscopy and scanning probe techniques. The research includes experiments and theory to understand the atomic, electronic, and magnetic structures of materials.

30

Using Scanning Acoustic Microscopy to Study Subsurface Defects ...  

Science Conference Proceedings (OSTI)

... surface (found during periodic inspections during the course of the experiments). ... Scanning—A Review," Proceedings of the IEEE, 67 (8) (August 1979), pp.

31

Near-Field Scanning Optical Microscopy (NSOM) Studies of the Relationship between Interchain Interactions, Morphology, Photodamage, and Energy Transport in Conjugated  

E-Print Network (OSTI)

for the last several years due to their potential for application in optoelectronic devices such as light-emitting diodes (LEDs),1,2 photodiodes,3 photovoltaics,4 and displays.5 It is becoming increasingly clear

Cohen, Ronald C.

32

Instrument Series: Microscopy Ultra-High Vacuum, Low- Temperature Scanning  

NLE Websites -- All DOE Office Websites (Extended Search)

Low- Low- Temperature Scanning Probe Microscope EMSL's ultra-high vacuum, low-temperature scanning probe microscope instrument, or UHV LT SPM, is the preeminent system dedicated to surface chemistry and physics at low temperatures down to 5 K. Operating at low temperatures provides high mechanical stability, superior vacuum conditions, and negligible drift for long-term experiments. With thermal diffusion being entirely suppressed, stable imaging becomes possible even for weakly bound species. The system is primarily used for probing single-site chemical reactivity, while the combination with a hyperthermal molecular beam allows the study of important chemical processes at energies corresponding to the operational temperatures well beyond typical UHV studies. The LT SPM provides

33

Instrument Series: Microscopy Aberration-Corrected Scanning/Transmission  

NLE Websites -- All DOE Office Websites (Extended Search)

Aberration-Corrected Aberration-Corrected Scanning/Transmission Electron Microscope EMSL's aberration-corrected Titan 80-300(tm) scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials. Research Applications

34

The theory and practice of high resolution scanning electron microscopy  

Science Conference Proceedings (OSTI)

Recent advances in instrumentation have produced the first commercial examples of what can justifiably be called High Resolution Scanning Electron Microscopes. The key components of such instruments are a cold field emission gun, a small-gap immersion probe-forming lens, and a clean dry-pumped vacuum. The performance of these microscopes is characterized by several major features including a spatial resolution, in secondary electron mode on solid specimens, which can exceed 1nm on a routine basis; an incident probe current density of the order of 10{sup 6} amps/cm{sup 2}; and the ability to maintain these levels of performance over an accelerating voltage range of from 1 to 30keV. This combination of high resolution, high probe current, low contamination and flexible electron-optical conditions provides many new opportunitites for the application of the SEM to materials science, physics, and the life sciences. 27 refs., 14 figs.

Joy, D.C. (Tennessee Univ., Knoxville, TN (USA) Oak Ridge National Lab., TN (USA))

1990-01-01T23:59:59.000Z

35

Near-field thermal transistor  

E-Print Network (OSTI)

Using a block of three separated solid elements, a thermal source and drain together with a gate made of an insulator-metal transition material exchanging near-field thermal radiation, we introduce a nanoscale analog of a field-effect transistor which is able to control the flow of heat exchanged by evanescent thermal photons between two bodies. By changing the gate temperature around its critical value, the heat flux exchanged between the hot body (source) and the cold body (drain) can be reversibly switched, amplified, and modulated by a tiny action on the gate. Such a device could find important applications in the domain of nanoscale thermal management and it opens up new perspectives concerning the development of contactless thermal circuits intended for information processing using the photon current rather than the electric current.

Ben-Abdallah, Philippe

2013-01-01T23:59:59.000Z

36

Development of New Methods in Scanning Probe Microscopy for Lignocellulosic Biomass Characterization  

E-Print Network (OSTI)

Methods Development of New Methods in Scanning Probe Microscopy for Lignocellulosic Biomass implicated in recalcitrance is important for utili- zation of lignocellulosic biomass in the world new technologies to explore the ultrastructure of biomass at nanoscale.4 Mode-synthesizing atomic

37

Near-field radiative heat transfer for structured surfaces  

E-Print Network (OSTI)

We apply an analytical approach for determining the near-field radiative heat transfer between a metallic nanosphere and a planar semi-infinite medium with some given surface structure. This approach is based on a perturbative expansion, and evaluated to first order in the surface profile. With the help of numerical results obtained for some simple model geometries we discuss typical signatures that should be obtainable with a near-field scanning thermal microscope operated in either constant-height or constant-distance mode.

Svend-Age Biehs; Oliver Huth; Felix Rüting

2011-03-15T23:59:59.000Z

38

Application of scanning mid-IR-laser microscopy for characterization of semiconductor materials for photovoltaics  

E-Print Network (OSTI)

The scanning mid-IR-laser microscopy was previously demonstrated as an effective tool for characterization of different semiconductor crystals. Now the technique has been successfully applied for the investigation of CZ SixGe1-x -- a promising material for photovoltaics - and multicrystalline silicon for solar cells. In addition, this technique was shown to be appropriate for imaging of polishing-induced defects as well as such huge defects as "pin holes". Besides, previously unexplained "anomalous" (cubic power) dependence of signal of the scanning mid-IR-laser microscope in the optical-beam-induced light scattering mode on the photoexcitation power obtained for mechanically polished samples has now been attributed to the excess carrier scattering on charged linear defects, likely dislocation lines. The conclusion is made in the article that the scanning mid-IR-laser microscopy may serve as very effective tool for defect investigations in materials for modern photovoltaics.

Kalinushkin, V P; Yuryev, V A; 10.1016/S0927-0248(00)00076-3

2011-01-01T23:59:59.000Z

39

Visualizing Macromolecular Complexes with In Situ Liquid Scanning Transmission Electron Microscopy  

SciTech Connect

A central focus of biological research is understanding the structure/function relationship of macromolecular protein complexes. Yet conventional transmission electron microscopy techniques are limited to static observations. Here we present the first direct images of purified macromolecular protein complexes using in situ liquid scanning transmission electron microscopy. Our results establish the capability of this technique for visualizing the interface between biology and nanotechnology with high fidelity while also probing the interactions of biomolecules within solution. This method represents an important advancement towards allowing future high-resolution observations of biological processes and conformational dynamics in real-time.

Evans, James E.; Jungjohann, K. L.; Wong, Peony C. K.; Chiu, Po-Lin; Dutrow, Gavin H.; Arslan, Ilke; Browning, Nigel D.

2012-11-01T23:59:59.000Z

40

Atomic-scale properties of semiconductor heterostructures probed by scanning tunneling microscopy  

SciTech Connect

The engineering of advanced semiconductor heterostructure materials and devices requires a detailed understanding of, and control over, the structure and properties of semiconductor materials and devices at the atomic to nanometer scale. Cross-sectional scanning tunneling microscopy has emerged as a unique and powerful method to characterize structural morphology and electronic properties in semiconductor epitaxial layers and device structures at these length scales. The basic experimental techniques in cross-sectional scanning tunneling microscopy are described, and some representative applications to semiconductor heterostructure characterization drawn from recent investigations in the authors laboratory are discussed. Specifically, they describe some recent studies of InP/InAsP and InAsP/InAsSb heterostructures in which nanoscale compositional clustering has been observed and analyzed.

Yu, E.T.; Zuo, S.L.; Bi, W.G.; Tu, C.W. [Univ. of California, San Diego, La Jolla, CA (United States). Dept. of Electrical and Computer Engineering; Biefeld, R.M.; Allerman, A.A. [Sandia National Labs., Albuquerque, NM (United States)

1998-05-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


41

Scanning transmission x-ray microscopy: A new ``looking glass`` into coal chemical structure  

SciTech Connect

This paper reports the use of scanning transmission x-ray microscopy to spatially map the chemistry of aromatic and aliphatic carbon functionalities in coal to a resolution of less than 0.1 {mu}m. Localized x-ray absorption spectroscopy recorded at the carbon K absorption edge was also used to facilitate analysis of variations in fundamental chemistry at maceral interfaces and within maceral boundaries.

Botto, R.E.; Cody, G.D.

1994-02-01T23:59:59.000Z

42

Three-dimensional characterization of near-field transducers by electron tomography  

SciTech Connect

Transmission electron microscopy (TEM) was employed to study the structure of near-field transducers (NFT) for applications in heat-assisted magnetic recording (HAMR) heads. The overall shape of NFTs that had passed or failed an optical test was similar, as determined by scanning transmission electron microscopy tomography. However, the absence of a well-defined peg and the presence of a flat top on the 'FAIL' NFT disk induced poor thermal heat transfer from the NFT to the phase change medium and resulted in the optical test failure. The thermal heating around the NFT led to Ta diffusion from the adjacent tantala core and to the presence of Ta-rich particles in the alumina matrix in the plane of the NFT. - Highlights: Black-Right-Pointing-Pointer Very site specific TEM specimen prepared by dual-beam SEM/FIB system. Black-Right-Pointing-Pointer Near field transducer characterization by STEM tomography. Black-Right-Pointing-Pointer Elemental analysis in 2D by STEM-EDX.

Liu, Yuzi, E-mail: yuziliu@anl.gov [Materials Science Division, Argonne National Laboratory, Argonne, IL 60439 (United States) [Materials Science Division, Argonne National Laboratory, Argonne, IL 60439 (United States); Center for Nanoscale Materials, Argonne National Laboratory, Argonne IL, 60439 (United States); Schreiber, Daniel K. [Materials Science Division, Argonne National Laboratory, Argonne, IL 60439 (United States) [Materials Science Division, Argonne National Laboratory, Argonne, IL 60439 (United States); Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208 (United States); Petford-Long, Amanda K. [Materials Science Division, Argonne National Laboratory, Argonne, IL 60439 (United States) [Materials Science Division, Argonne National Laboratory, Argonne, IL 60439 (United States); Center for Nanoscale Materials, Argonne National Laboratory, Argonne IL, 60439 (United States); Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208 (United States); Gao, Kai-Zhong [Head and Media R and D, Seagate Technology, Bloomington, MN 55435 (United States)] [Head and Media R and D, Seagate Technology, Bloomington, MN 55435 (United States)

2012-10-15T23:59:59.000Z

43

Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscopy Home Staff Only Microscopy Group Staff InstrumentationCapabilities The Advanced Microscopy Laboratory (AML) Microscopy User Centers: MAUC SHaRE Research Highlights...

44

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

Science Conference Proceedings (OSTI)

Scanning transmission x-ray microscopy (STXM) combines x-ray microscopy and near edge x-ray absorption fine structure spectroscopy (NEXAFS). This combination provides spatially resolved bonding and oxidation state information. While there are reviews relevant to STXM/NEXAFS applications in other environmental fields (and magnetic materials) this chapter focuses on atmospheric aerosols. It provides an introduction to this technique in a manner approachable to non-experts. It begins with relevant background information on synchrotron radiation sources and a description of NEXAFS spectroscopy. The bulk of the chapter provides a survey of STXM/NEXAFS aerosol studies and is organized according to the type of aerosol investigated. The purpose is to illustrate the current range and recent growth of scientific investigations employing STXM-NEXAFS to probe atmospheric aerosol morphology, surface coatings, mixing states, and atmospheric processing.

Moffet, Ryan C.; Tivanski, Alexei V.; Gilles, Mary K.

2011-01-20T23:59:59.000Z

45

Principal Component Analysis of Spectroscopic Imaging Data in Scanning Probe Microscopy  

SciTech Connect

The approach for data analysis in band excitation family of scanning probe microscopies based on principal component analysis (PCA) is explored. PCA utilizes the similarity between spectra within the image to select the relevant response components. For small signal variations within the image, the PCA components coincide with the results of deconvolution using simple harmonic oscillator model. For strong signal variations, the PCA allows effective approach to rapidly process, de-noise and compress the data. The extension of PCA for correlation function analysis is demonstrated. The prospects of PCA as a universal tool for data analysis and representation in multidimensional SPMs are discussed.

Jesse, Stephen [ORNL; Kalinin, Sergei V [ORNL

2009-01-01T23:59:59.000Z

46

Robust atomic resolution imaging of light elements using scanning transmission electron microscopy  

SciTech Connect

We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics.

Findlay, S. D. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Shibata, N. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); PRESTO, Japan Science and Technology Agency, Saitama 332-0012 (Japan); Sawada, H.; Okunishi, E.; Kondo, Y. [JEOL Ltd., Tokyo 196-8558 (Japan); Yamamoto, T. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587 (Japan); Ikuhara, Y. [Institute of Engineering Innovation, School of Engineering, University of Tokyo, Tokyo 113-8656 (Japan); Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587 (Japan); WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)

2009-11-09T23:59:59.000Z

47

Structure and Reactions of Carbon and Hydrogen on Ru(0001): A Scanning Tunneling Microscopy Study  

DOE Green Energy (OSTI)

The interaction between carbon and hydrogen atoms on a Ru(0001) surface was studied using scanning tunneling microscopy (STM), Density Functional Theory (DFT) and STM image calculations. Formation of CH species by reaction between adsorbed H and C was observed to occur readily at 100 K. When the coverage of H increased new complexes of the form CH+nH (n = 1, 2 and 3) were observed. These complexes, never observed before, might be precursors for further hydrogenation reactions. DFT analysis reveals that a considerable energy barrier exists for the CH+H {yields} CH{sub 2} reaction.

Shimizu, Tomoko K.; Mugarza, Aitor; Cerda, Jorge; Salmeron, Miquel

2008-09-09T23:59:59.000Z

48

Monitoring charge storage processes in nanoscale oxides using electrochemical scanning probe microscopy.  

Science Conference Proceedings (OSTI)

Advances in electrochemical energy storage science require the development of new or the refinement of existing in situ probes that can be used to establish structure - activity relationships for technologically relevant materials. The drive to develop reversible, high capacity electrodes from nanoscale building blocks creates an additional requirement for high spatial resolution probes to yield information of local structural, compositional, and electronic property changes as a function of the storage state of a material. In this paper, we describe a method for deconstructing a lithium ion battery positive electrode into its basic constituents of ion insertion host particles and a carbon current collector. This model system is then probed in an electrochemical environment using a combination of atomic force microscopy and tunneling spectroscopy to correlate local activity with morphological and electronic configurational changes. Cubic spinel Li{sub 1+x}Mn{sub 2-x}O{sub 4} nanoparticles are grown on graphite surfaces using vacuum deposition methods. The structure and composition of these particles are determined using transmission electron microscopy and Auger microprobe analysis. The response of these particles to initial de-lithiation, along with subsequent electrochemical cycling, is tracked using scanning probe microscopy techniques in polar aprotic electrolytes (lithium hexafluorophosphate in ethylene carbonate:diethylcarbonate). The relationship between nanoparticle size and reversible ion insertion activity will be a specific focus of this paper.

Zavadil, Kevin Robert; Lu, Ping; Huang, Jian Yu

2010-11-01T23:59:59.000Z

49

Near field optical scanning system employing microfabricated solid immersion lens  

DOE Patents (OSTI)

A solid immersion lens integrated on a flexible support such as a cantilever or membrane is described, together with a method of forming the integrated structure.

Cozier, Kenneth B. (Stanford, CA); Fletcher, Daniel A. (Menlo Park, CA); Kino, Gordon S. (Stanford, CA); Quate, Calvin F. (Stanford, CA); Soh, Hyongsok T. (Stanford, CA)

2002-08-27T23:59:59.000Z

50

Near-Field Scanning Microwave Microscope: Big at the ...  

Science Conference Proceedings (OSTI)

... resolution for such a wide range of samples, including semiconductors, semiconducting nanowire, materials for photovoltaic applications, magnetic ...

2012-11-08T23:59:59.000Z

51

Laser wavelength effects in ultrafast near-field laser nanostructuring...  

NLE Websites -- All DOE Office Websites (Extended Search)

Laser wavelength effects in ultrafast near-field laser nanostructuring of Si Title Laser wavelength effects in ultrafast near-field laser nanostructuring of Si Publication Type...

52

Scanning tunneling microscopy reveals LiMnAs is a room temperature anti-ferromagnetic semiconductor  

SciTech Connect

We performed scanning tunneling microscopy and spectroscopy on a LiMnAs(001) thin film epitaxially grown on an InAs(001) substrate by molecular beam epitaxy. While the in situ cleavage exposed only the InAs(110) non-polar planes, the cleavage continued into the LiMnAs thin layer across several facets. We combined both topography and current mappings to confirm that the facets correspond to LiMnAs. By spectroscopy we show that LiMnAs has a band gap. The band gap evidenced in this study, combined with the known Neel temperature well above room temperature, confirms that LiMnAs is a promising candidate for exploring the concepts of high temperature semiconductor spintronics based on antiferromagnets.

Wijnheijmer, A. P.; Koenraad, P. M. [COBRA Inter-University Research Institute, Department of Applied Physics, Eindhoven University of Technology, P. O. Box 513, NL-5600 MB Eindhoven (Netherlands); Marti, X. [Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 3, 121 16 Prague 2 (Czech Republic); Institute of Physics ASCR, v.v.i., Cukrovarnicka 10, 162 53 Prague 6 (Czech Republic); Holy, V. [Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 3, 121 16 Prague 2 (Czech Republic); Cukr, M.; Novak, V. [Institute of Physics ASCR, v.v.i., Cukrovarnicka 10, 162 53 Prague 6 (Czech Republic); Jungwirth, T. [Institute of Physics ASCR, v.v.i., Cukrovarnicka 10, 162 53 Prague 6 (Czech Republic); School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD (United Kingdom)

2012-03-12T23:59:59.000Z

53

Hydrogen adsorption on Ru(001) studied by Scanning TunnelingMicroscopy  

SciTech Connect

The adsorption of hydrogen on Ru(001) was studied by scanning tunneling microscopy at temperatures around 50 K. Hydrogen was found to adsorb dissociatively forming different ordered structures as a function of coverage. In order of increasing coverage {theta} in monolayers (ML) these were ({radical}3 x {radical}3)r30{sup o} at {theta} = 0.3 ML; (2 x 1) at {theta} = 0.50 ML, (2 x 2)-3H at {theta} = 0.75, and (1 x 1) at {theta} = 1.00. Some of these structures were observed to coexist at intermediate coverage values. Close to saturation of 1 ML, H-vacancies (unoccupied three fold fcc hollow Ru sites) were observed either as single entities or forming transient aggregations. These vacancies diffuse and aggregate to form active sites for the dissociative adsorption of hydrogen.

Tatarkhanov, Mous; Rose, Franck; Fomin, Evgeny; Ogletree, D.Frank; Salmeron, Miquel

2008-01-18T23:59:59.000Z

54

Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device  

Science Conference Proceedings (OSTI)

A high-speed direct electron detection system is introduced to the field of transmission electron microscopy and applied to strain measurements in semiconductor nanostructures. In particular, a focused electron probe with a diameter of 0.5 nm was scanned over a fourfold quantum layer stack with alternating compressive and tensile strain and diffracted discs have been recorded on a scintillator-free direct electron detector with a frame time of 1 ms. We show that the applied algorithms can accurately detect Bragg beam positions despite a significant point spread each 300 kV electron causes during detection on the scintillator-free camera. For millisecond exposures, we find that strain can be measured with a precision of 1.3 Multiplication-Sign 10{sup -3}, enabling, e.g., strain mapping in a 100 Multiplication-Sign 100 nm{sup 2} region with 0.5 nm resolution in 40 s.

Mueller, Knut; Rosenauer, Andreas [Institut fuer Festkoerperphysik, Universitaet Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany); Ryll, Henning; Ordavo, Ivan; Ihle, Sebastian; Soltau, Heike [PNSensor GmbH, Roemerstrasse 28, 80803 Muenchen (Germany); Strueder, Lothar [Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany); Volz, Kerstin [Materials Science Center and Faculty of Physics, Philipps Universitaet Marburg, Hans-Meerwein-Strasse, 35032 Marburg (Germany); Zweck, Josef [Institut fuer Experimentelle und Angewandte Physik, Universitaet Regensburg, Universitaetsstrasse 31, 93040 Regensburg (Germany)

2012-11-19T23:59:59.000Z

55

Evaluation of near-field earthquake effects  

SciTech Connect

Structures and equipment, which are qualified for the design basis earthquake (DBE) and have anchorage designed for the DBE loading, do not require an evaluation of the near-field earthquake (NFE) effects. However, safety class 1 acceleration sensitive equipment such as electrical relays must be evaluated for both NFE and DBE since they are known to malfunction when excited by high frequency seismic motions.

Shrivastava, H.P.

1994-11-01T23:59:59.000Z

56

Scanning Hall Probe Microscopy of Magnetic Vortices inVery Underdoped yttrium-barium-copper-oxide  

Science Conference Proceedings (OSTI)

Since their discovery by Bednorz and Mueller (1986), high-temperature cuprate superconductors have been the subject of intense experimental research and theoretical work. Despite this large-scale effort, agreement on the mechanism of high-T{sub c} has not been reached. Many theories make their strongest predictions for underdoped superconductors with very low superfluid density n{sub s}/m*. For this dissertation I implemented a scanning Hall probe microscope and used it to study magnetic vortices in newly available single crystals of very underdoped YBa{sub 2}Cu{sub 3}O{sub 6+x} (Liang et al. 1998, 2002). These studies have disproved a promising theory of spin-charge separation, measured the apparent vortex size (an upper bound on the penetration depth {lambda}{sub ab}), and revealed an intriguing phenomenon of ''split'' vortices. Scanning Hall probe microscopy is a non-invasive and direct method for magnetic field imaging. It is one of the few techniques capable of submicron spatial resolution coupled with sub-{Phi}{sub 0} (flux quantum) sensitivity, and it operates over a wide temperature range. Chapter 2 introduces the variable temperature scanning microscope and discusses the scanning Hall probe set-up and scanner characterizations. Chapter 3 details my fabrication of submicron GaAs/AlGaAs Hall probes and discusses noise studies for a range of probe sizes, which suggest that sub-100 nm probes could be made without compromising flux sensitivity. The subsequent chapters detail scanning Hall probe (and SQUID) microscopy studies of very underdoped YBa{sub 2}Cu{sub 3}O{sub 6+x} crystals with T{sub c} {le} 15 K. Chapter 4 describes two experimental tests for visons, essential excitations of a spin-charge separation theory proposed by Senthil and Fisher (2000, 2001b). We searched for predicted hc/e vortices (Wynn et al. 2001) and a vortex memory effect (Bonn et al. 2001) with null results, placing upper bounds on the vison energy inconsistent with the theory. Chapter 5 discusses imaging of isolated vortices as a function of T{sub c}. Vortex images were fit with theoretical magnetic field profiles in order to extract the apparent vortex size. The data for the lowest T{sub c}'s (5 and 6.5 K) show some inhomogeneity and suggest that {lambda}{sub ab} might be larger than predicted by the T{sub c} {proportional_to} n{sub s}(0)/m* relation first suggested by results of Uemura et al. (1989) for underdoped cuprates. Finally, Chapter 6 examines observations of apparent ''partial vortices'' in the crystals. My studies of these features indicate that they are likely split pancake vortex stacks. Qualitatively, these split stacks reveal information about pinning and anisotropy in the samples. Collectively these magnetic imaging studies deepen our knowledge of cuprate superconductivity, especially in the important regime of low superfluid density.

Guikema, Janice Wynn; /SLAC, SSRL

2005-12-02T23:59:59.000Z

57

Scanning tunneling microscopy observation of Pb-induced superstructures on Si(557)  

Science Conference Proceedings (OSTI)

Pb-induced superstructures on Si(557) are investigated by low-energy-electron diffraction (LEED) and scanning tunneling microscopy (STM). Using an indirect heating method, we have succeeded in obtaining almost perfect single-domain LEED patterns of one-dimensional wire (chain) structures, so called {alpha}x2 and {beta}x2 phases. Careful LEED analysis and STM investigation reveal that these phases are formed on the (223) and (112) facets, respectively. The {alpha}x2 phase has regular bundles of triple wires at low annealing temperature but wider bundles through step bunching after a higher temperature annealing. Along the wires of the {alpha}x2 phase, which was recently reported to exhibit a transition between one-dimensional (1D) metallic and 2D semiconducting conductance, a clear commensurate x2 modulation is observed at 78-120 K in contrast to the incommensurate and disordered structure reported previously. A tentative atomic structure model of the {alpha}x2 phase is proposed based on the dense Pb overlayers on (111) and (223) facets. The details of the STM images of the {beta}x2 phase are discussed.

Morikawa, Harumo; Kim, Keun Su; Jung, Duk Yong; Yeom, Han Woong [Institute of Physics and Applied Physics and Center for Atomic Wires and Layers, Yonsei University, 134 Shinchon, Seoul 120-749 (Korea, Republic of)

2007-10-15T23:59:59.000Z

58

Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy  

Science Conference Proceedings (OSTI)

Observation of growth, synthesis, dynamics and electrochemical reactions in the liquid state is an important yet largely unstudied aspect of nanotechnology. The only techniques that can potentially provide the insights necessary to advance our understanding of these mechanisms is simultaneous atomic-scale imaging and quantitative chemical analysis (through spectroscopy) under environmental conditions in the transmission electron microscope (TEM). In this study we describe the experimental and technical conditions necessary to obtain electron energy loss (EEL) spectra from a nanoparticle in colloidal suspension using aberration corrected scanning transmission electron microscopy (STEM) combined with the environmental liquid stage. At a fluid path length below 400 nm, atomic resolution images can be obtained and simultaneous compositional analysis can be achieved. We show that EEL spectroscopy can be used to quantify the total fluid path length around the nanoparticle, and demonstrate characteristic core-loss signals from the suspended nanoparticles can be resolved and analyzed to provide information on the local interfacial chemistry with the surrounding environment. The combined approach using aberration corrected STEM and EEL spectra with the in situ fluid stage demonstrates a plenary platform for detailed investigations of solution based catalysis and biological research.

Jungjohann, K. L.; Evans, James E.; Aguiar, Jeff; Arslan, Ilke; Browning, Nigel D.

2012-06-04T23:59:59.000Z

59

FORCE SENSING IN SCANNING TUNNELING MICROSCOPY U. DURIG, J.K. GIMZEWSKI, D.W. POHL and R. SCHLITTLER  

E-Print Network (OSTI)

FORCE SENSING IN SCANNING TUNNELING MICROSCOPY U. DURIG, J.K. GIMZEWSKI, D.W. POHL and R, (1986) 930. [3] U. Durig, J.K. Gimzewski, and D.W. Pohl, Phys. Rev. Lett., in press. [4] J. Soler, A

Gimzewski, James

60

Direct measurement of interfacial structure in epitaxial Gd2O3 on GaAs (001) using scanning tunneling microscopy  

Science Conference Proceedings (OSTI)

The epitaxial growth of Gd"2O"3 on GaAs (001) has given a low interfacial density of states, resulting in the demonstration of the first inversion-channel GaAs metal-oxide-semiconductor field-effect transistor. Motivated by the significance of this discovery, ... Keywords: Electronic information, GaAs, Gd2O3, Interfacial stacking, Scanning tunneling microscopy

Y. P. Chiu; M. C. Shih; B. C. Huang; J. Y. Shen; M. L. Huang; W. C. Lee; P. Chang; T. H. Chiang; M. Hong; J. Kwo

2011-07-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
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they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
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61

SCANNING ELECTRON MICROSCOPY AND X-RAY DIFFRACTION ANALYSIS OF TANK 18 SAMPLES  

Science Conference Proceedings (OSTI)

The F-Area Tank Farm (FTF) Performance Assessment (PA) utilizes waste speciation in the waste release model used in the FTF fate and transport modeling. The waste release modeling associated with the residual plutonium in Tank 18 has been identified as a primary contributor to the Tank 18 dose uncertainty. In order to reduce the uncertainty related to plutonium in Tank 18, a better understanding of the plutonium speciation in the Tank 18 waste (including the oxidation state and stoichiometry) is desired. Savannah River National Laboratory (SRNL) utilized Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to analyze Tank 18 samples to provide information on the speciation of plutonium in the waste material. XRD analysis of the Tank 18 samples did not identify any plutonium mineral phases in the samples. These indicates the crystalline mineral phases of plutonium are below the detection limits of the XRD method or that the plutonium phase(s) lack long range order and are present as amorphous or microcrystalline solids. SEM analysis of the Tank 18 samples did locate particles containing plutonium. The plutonium was found as small particles, usually <1 {micro}m but ranging up to several micrometers in diameter, associated with particles of an iron matrix and at low concentration in other elemental matrices. This suggests the plutonium has an affinity for the iron matrix. Qualitatively, the particles of plutonium found in the SEM analysis do not appear to account for all of the plutonium in the sample based on concentrations determined from the chemical analysis of the Tank 18 samples. This suggests that plutonium is also distributed throughout the solids in low concentrations.

Hay, M.; O'Rourke, P.; Ajo, H.

2012-03-08T23:59:59.000Z

62

Near Field Environment Process Model Report  

SciTech Connect

Although there are uncertainties and issues of heterogeneities in properties, the overall binary coupling between thermal, hydrological, chemical, and mechanical processes in the near-field environment is understood, as discussed above. Ternary coupling among these processes has been investigated experimentally and computationally with good agreement. Simultaneous coupling of all four types of processes has not yet been addressed, but multiple combinations of ternary couplings have been investigated. Based on these considerations, THCM processes are not inconsistent with the treatment of repository performance in TSPA. Ranges of parameters are used in TSPA to account for uncertainty and investigate the sensitivity to specific processes and events. Ongoing work will further reduce these uncertainties and increase confidence in coupled-process models that must predict responses over geologic time scales.

2001-01-05T23:59:59.000Z

63

Scanning tunneling microscopy studies on the structure and stability of model catalysts  

E-Print Network (OSTI)

An atomic level understanding of the structure and stability of model catalysts is essential for surface science studies in heterogeneous catalysis. Scanning tunneling microscopy (STM) can operate both in UHV and under realistic pressure conditions with a wide temperature span while providing atomic resolution images. Taking advantage of the ability of STM, our research focuses on 1) investigating the structure and stability of supported Au catalysts, especially under CO oxidation conditions, and 2) synthesizing and characterizing a series of alloy model catalysts for future model catalytic studies. In our study, Au clusters supported on TiO2(110) have been used to model supported Au catalysts. Our STM studies in UHV reveal surface structures of TiO2(110) and show undercoordinated Ti cations play a critical role in the nucleation and stabilization of Au clusters on TiO2(110). Exposing the TiO2(110) surface to water vapor causes the formation of surface hydroxyl groups and subsequently alters the growth kinetics of Au clusters on TiO2(110). STM studies on Au/TiO2(110) during CO oxidation demonstrate the real surface of a working catalyst. Au clusters supported on TiO2(110) sinter rapidly during CO oxidation, but are mostly stable in the single component reactant gas, either CO or O2. The sintering kinetics of supported Au clusters has been measured during CO oxidation and gives an activation energy, which supports the mechanism of CO oxidation induced sintering. CO oxidation was also found to accelerate the surface diffusion of Rh(110). Our results show a direct correlation between the reaction rate of CO oxidation and the diffusion rate of surface metal atoms. Synthesis of alloy model catalysts have also been attempted in our study with their structures successfully characterized. Planar Au-Pd alloy films has been prepared on a Rh(100) surface with surface Au and Pd atoms distinguished by STM. The growth of Au-Ag alloy clusters have been studied by in-situ STM on a cluster-to-cluster basis. Moreover, the atomic structure of a solution-prepared Ru3Sn3 cluster has been resolved on an ultra-thin silica film surface. The atomic structure and adsorption sites of the ultrathin silica film have also been well characterized in our study.

Yang, Fan

2007-12-01T23:59:59.000Z

64

Near-field/altered-zone models report  

Science Conference Proceedings (OSTI)

The U.S. Department of Energy is studying Yucca Mountain as the possible site for the first underground repository for permanent disposal of spent fuel from commercial nuclear reactors as well as for other types high-level nuclear waste. Emplacement of high-level radioactive waste, especially commercial spent nuclear fuel (CSNF), in Yucca Mountain will release a large amount of heat into the rock above and below the repository. The heating rate will decrease with time, creating a thermal pulse. Over a period of several thousand years, the rock temperature will rise initially, then drop when the production of decay heat falls below the rate at which heat escapes from the hot zone. Besides raising the rock temperature, much of this heat will vaporize water, which will then condense in cooler regions. The condensate is likely to form a gravity-driven heat pipe above the repository, creating the possibility that water may drain back onto the waste packages (WPs) or that it may ''shed'' through the pillars between emplacement drifts. The long-term importance of these effects has been investigated through the development, testing, and application of thermohydrologic (TH) models. Other effects, such coupled chemical and mechanical processes, may also influence the movement of water above, within, and below the emplacement drifts. A recent report on thermally driven coupled processes (Hardin and Chesnut, 1997) provides a qualitative assessment of the probable significance of these processes for the Yucca Mountain Site Characterization Project (YMSCP) and is the phenomenological framework for the present report. This report describes the conceptual and numerical models that have been developed to predict the thermal, mechanical, hydrologic, and chemical responses to the cumulative heat production of the potential host rock at Yucca Mountain. As proposed, the repository horizon will be situated within the Topopah Spring tuff, in the adjacent middle nonlithophysal and lower lithophysal units. These units are made up of moderately to densely welded, devitrified, fractured tuff. The rock's chemical composition is comparable to that of typical granite, but has textural features and mineralogical characteristics of large-scale, silicic volcanism. Because the repository horizon will be approximately 300 m below the ground surface and 200 m above the water table, the repository will be partially saturated. The welded tuff matrix in the host units is highly impermeable, but water and gas flow readily through fractures. The degree of fracturing in these units is highly variable, and the hydrologic significance of fracturing is an important aspect of site investigation. This report describes the characterization and modeling of a region around the potential repository--the altered zone--a region in which the temperature will be increased significantly by waste-generated heat. Numerical simulation has shown that, depending on the boundary conditions, rock properties, and repository design features incorporated in the models, the altered zone (AZ) may extend from the water table to the ground surface. This report also describes models of the near field, the region comprising the repository emplacement drifts and the surrounding rock, which are critical to the performance of engineered components. Investigations of near-field and altered-zone (NF/AZ) processes support the design of underground repository facilities and engineered barriers and also provide constraint data for probabilistic calculations of waste-isolation performance (i.e., performance assessment). The approach to investigation, which is an iterative process involving hypothesis testing and experimentation, has relied on conceptualizing engineered barriers and on performance analysis. This report is a collection, emphasizing conceptual and numerical models, of the recent results contributed from studies of NF/AZ processes and of quantitative measures of NF/AZ performance. The selection and presentation of contributions are intended to show the iterative development of understand

Hardin, E. L., LLNL

1998-03-01T23:59:59.000Z

65

Adsorbate structures and catalytic reactions studied in the torrpressure range by scanning tunneling microscopy  

DOE Green Energy (OSTI)

High-pressure, high-temperature scanning tunneling microscopy (HPHTSTM) was used to study adsorbate structures and reactions on single crystal model catalytic systems. Studies of the automobile catalytic converter reaction [CO + NO {yields} 1/2 N{sub 2} + CO{sub 2}] on Rh(111) and ethylene hydrogenation [C{sub 2}H{sub 4} + H{sub 2} {yields} C{sub 2}H{sub 6}] on Rh(111) and Pt(111) elucidated information on adsorbate structures in equilibrium with high-pressure gas and the relationship of atomic and molecular mobility to chemistry. STM studies of NO on Rh(111) showed that adsorbed NO forms two high-pressure structures, with the phase transformation from the (2 x 2) structure to the (3 x 3) structure occurring at 0.03 Torr. The (3 x 3) structure only exists when the surface is in equilibrium with the gas phase. The heat of adsorption of this new structure was determined by measuring the pressures and temperatures at which both (2 x 2) and (3 x 3) structures coexisted. The energy barrier between the two structures was calculated by observing the time necessary for the phase transformation to take place. High-pressure STM studies of the coadsorption of CO and NO on Rh(111) showed that CO and NO form a mixed (2 x 2) structure at low NO partial pressures. By comparing surface and gas compositions, the adsorption energy difference between topsite CO and NO was calculated. Occasionally there is exchange between top-site CO and NO, for which we have described a mechanism for. At high NO partial pressures, NO segregates into islands, where the phase transformation to the (3 x 3) structure occurs. The reaction of CO and NO on Rh(111) was monitored by mass spectrometry (MS) and HPHTSTM. From MS studies the apparent activation energy of the catalytic converter reaction was calculated and compared to theory. STM showed that under high-temperature reaction conditions, surface metal atoms become mobile. Ethylene hydrogenation and its poisoning by CO was also studied by STM on Rh(111) and Pt(111). Poisoning was found to coincide with decreased adsorbate mobility. Under ethylene hydrogenation conditions, no order is detected by STM at 300 K, as hydrogen and ethylidyne, the surface species formed by gas-phase ethylene, are too mobile. When CO is introduced, the reaction stops, and ordered structures appear on the surface. For Rh(111), the structure is predominantly a mixed c(4 x 2), though there are some areas of (2 x 2). For Pt(111), the structure is hexagonal and resembles the Moire pattern seen when Pt(111) is exposed to pure CO. From these studies it is concluded that CO poisons by stopping adsorbate mobility. This lack of adsorbate mobility prevents the adsorption of ethylene from the gas phase by hindering the creation of adsorption sites.

Hwang, Kevin Shao-Lin

2003-05-23T23:59:59.000Z

66

Antenna Parameter Measurement by Near-Field Techniques  

Science Conference Proceedings (OSTI)

... Lab Tour. Thursday, September 20th. ... Lab Tour. September 20th. Ron Wittmann (Spherical Near-Field Theory); Michael Francis (Uncertainty Analysis ...

2012-04-25T23:59:59.000Z

67

Conference Paper NFO-7:7th International Conference on Near-Field Optics and Related Technologies  

Science Conference Proceedings (OSTI)

The seventh conference in the NFO conference series, held here in Rochester, provided to be the principal forum for advances in sub-wavelength optics, near-field optical microscopy, local field enhancement, instrumental developments and the ever-increasing range of applications. This conference brought together the diverse scientific communities working on the theory and application of near-field optics (NFO) and related techniques.

Prof.Dr. Lukas Novotny

2004-10-18T23:59:59.000Z

68

Method for imaging liquid and dielectric materials with scanning polarization force microscopy  

DOE Patents (OSTI)

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

Hu, Jun (Berkeley, CA); Ogletree, D. Frank (El Cerrito, CA); Salmeron, Miguel (El Cerrito, CA); Xiao, Xudong (Kowloon, CN)

1999-01-01T23:59:59.000Z

69

Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy  

DOE Patents (OSTI)

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

1998-04-28T23:59:59.000Z

70

Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy  

SciTech Connect

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

Hu, Jun (Berkeley, CA); Ogletree, D. Frank (El Cerrito, CA); Salmeron, Miguel (El Cerrito, CA); Xiao, Xudong (Kowloon, CN)

1998-01-01T23:59:59.000Z

71

Method for imaging liquid and dielectric materials with scanning polarization force microscopy  

DOE Patents (OSTI)

The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

1999-03-09T23:59:59.000Z

72

Scanning mid-IR-laser microscopy: an efficient tool for materials studies in silicon-based photonics and photovoltaics  

E-Print Network (OSTI)

A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in the industries of microelectronics and photovoltaics. The basis for this development was laid with a wide cycle of investigations on low-angle mid-IR-light scattering in semiconductors. The essence of the technical idea was to apply the dark-field method for spatial filtering of the scattered light in the scanning mid-IR-laser microscope together with the local photoexcitation of excess carriers within a small domain in a studied sample, thus forming an artificial source of scattering of the probe IR light for the recombination contrast imaging of defects. The current paper presents three contrasting examples of application of the above technique for defect visualization in silicon-based materials designed for photovoltaics and photonics which demonstrate that this...

Astafiev, O V; Yuryev, V A; 10.1016/S0022-0248(99)00711-3

2011-01-01T23:59:59.000Z

73

A new bend magnet beam line for scanning transmission x-ray microscopy at the Advanced Light Source  

Science Conference Proceedings (OSTI)

The high brightness of the bend magnets at the Advanced Light Source has been exploited to illuminate a Scanning Transmission X-ray Microscope (STXM). This is the first diffraction-limited scanning x-ray microscope to operate with useful count rate on a synchrotron bend magnet source. A simple, dedicated beam line has been built covering the range of photon energy from 250 eV to 600 eV. Ease of use and operational availability are radically improved compared to previous installations using undulator beams. This facility provides radiation for C 1s, N 1s and O 1s near edge x-ray absorption spectro-microscopy with a spectral resolution up to about 1:5000 and with STXM count rates in excess of 1 MHz.

Warwick, Tony; Ade, Harald; Kilcoyne, A.L. David; Kritscher, Michael; Tylisczcak, Tolek; Fakra, Sirine; Hitchcock, Adam P.; Hitchcock, Peter; Padmore, Howard A.

2001-12-12T23:59:59.000Z

74

Scanning-tunneling-microscopy studies of disilane adsorption and pyrolytic growth on Si(100)-(2x1)  

SciTech Connect

Scanning tunneling microscopy has been employed to study the adsorption of disilane (Si{sub 2}H{sub 6}) and pyrolytic growth on Si(100)-(2{times}1) at various temperatures. Room-temperature exposures result in a random distribution of dissociation fragments on the surface. Formation of anisotropic monohydride islands and denuded zones as well as island coarsening is observed at higher temperatures. The results are strikingly similar to those reported for growth by molecular-beam epitaxy using pure Si, even though different surface reactions are involved in these two growth processes.

Lin, D.; Hirschorn, E.S.; Chiang, T. (Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)); Tsu, R.; Lubben, D.; Greene, J.E. (Department of Materials Science, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States) Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States))

1992-02-15T23:59:59.000Z

75

Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy  

DOE Patents (OSTI)

A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

Kazmerski, Lawrence L. (Lakewood, CO)

1990-01-01T23:59:59.000Z

76

Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy  

DOE Patents (OSTI)

An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.

Jesse, Stephen; Kalinin, Sergei V; Nikiforov, Maxim P

2013-07-09T23:59:59.000Z

77

Quasi-real-time analysis of dynamic near field scattering data using a graphics processing unit  

E-Print Network (OSTI)

We present an implementation of the analysis of dynamic near field scattering (NFS) data using a graphics processing unit (GPU). We introduce an optimized data management scheme thereby limiting the number of operations required. Overall, we reduce the processing time from hours to minutes, for typical experimental conditions. Previously the limiting step in such experiments, the processing time is now comparable to the data acquisition time. Our approach is applicable to various dynamic NFS methods, including shadowgraph, Schlieren and differential dynamic microscopy.

Giovanni Cerchiari; Fabrizio Croccolo; Frédéric Cardinaux; Frank Scheffold

2012-09-15T23:59:59.000Z

78

Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters  

Science Conference Proceedings (OSTI)

Atomic-resolution imaging in the scanning transmission electron microscope (STEM) constitutes a powerful tool for nanostructure characterization. Here, we demonstrate the quantitative interpretation of atomic-resolution high-angle annular dark-field (ADF) STEM images using an approach that does not rely on adjustable parameters. We measure independently the instrumental parameters that affect sub-0.1 nm-resolution ADF images, quantify their individual and collective contributions to the image intensity, and show that knowledge of these parameters enables a quantitative interpretation of the absolute intensity and contrast across all accessible spatial frequencies. The analysis also provides a method for the in-situ measurement of the STEM's effective source distribution.

Dwyer, C. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Department of Materials Engineering, Monash University, Victoria 3800 (Australia); ARC Centre of Excellence for Design in Light Metals, Monash University, Victoria 3800 (Australia); Maunders, C. [Department of Materials Engineering, Monash University, Victoria 3800 (Australia); Zheng, C. L. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Weyland, M.; Etheridge, J. [Monash Centre for Electron Microscopy, Monash University, Victoria 3800 (Australia); Department of Materials Engineering, Monash University, Victoria 3800 (Australia); Tiemeijer, P. C. [FEI Electron Optics, P.O. Box 80066, 5600 KA Eindhoven (Netherlands)

2012-05-07T23:59:59.000Z

79

Low Temperature Scanning Force Microscopy of the Si(111)-( 7x7) Surface  

Science Conference Proceedings (OSTI)

A low temperature scanning force microscope (SFM) operating in a dynamic mode in ultrahigh vacuum was used to study the Si(111)-(7x7) surface at 7.2 K. Not only the twelve adatoms but also the six rest atoms of the unit cell are clearly resolved for the first time with SFM. In addition, the first measurements of the short range chemical bonding forces above specific atomic sites are presented. The data are in good agreement with first principles computations and indicate that the nearest atoms in the tip and sample relax significantly when the tip is within a few Angstrom of the surface. (c) 2000 The American Physical Society.

Lantz, M. A. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Hug, H. J. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Schendel, P. J. A. van [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Hoffmann, R. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Martin, S. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Baratoff, A. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Abdurixit, A. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Guentherodt, H.-J. [Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, (Switzerland); Gerber, Ch. [IBM Research Division, Zuerich Research Laboratory, Saeumerstrasse 4, CH-8803 Rueschlikon, (Switzerland)

2000-03-20T23:59:59.000Z

80

Surface wave multipath signals in near-field microwave imaging  

Science Conference Proceedings (OSTI)

Microwave imaging techniques are prone to signal corruption from unwanted multipath signals. Near-field systems are especially vulnerable because signals can scatter and reflect from structural objects within or on the boundary of the imaging zone. These ...

Paul M. Meaney; Fridon Shubitidze; Margaret W. Fanning; Maciej Kmiec; Neil R. Epstein; Keith D. Paulsen

2012-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


81

GaSb/GaAs quantum dot formation and demolition studied with cross-sectional scanning tunneling microscopy  

Science Conference Proceedings (OSTI)

We present a cross-sectional scanning tunneling microscopy study of GaSb/GaAs quantum dots grown by molecular beam epitaxy. Various nanostructures are observed as a function of the growth parameters. During growth, relaxation of the high local strain fields of the nanostructures plays an important role in their formation. Pyramidal dots with a high Sb content are often accompanied by threading dislocations above them. GaSb ring formation is favored by the use of a thin GaAs first cap layer and a high growth temperature of the second cap layer. At these capping conditions, strain-driven Sb diffusion combined with As/Sb exchange and Sb segregation remove the center of a nanostructure, creating a ring. Clusters of GaSb without a well defined morphology also appear regularly, often with a highly inhomogeneous structure which is sometimes divided up in fragments.

Smakman, E. P.; Garleff, J. K.; Rambabu, P.; Koenraad, P. M. [Department of Applied Physics, Eindhoven University of Technology, Eindhoven 5612 AZ (Netherlands); Young, R. J.; Hayne, M. [Department of Physics, Lancaster University, Lancaster LA1 4YB (United Kingdom)

2012-04-02T23:59:59.000Z

82

Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ioni Beam-scanning Electron Microscopy  

Science Conference Proceedings (OSTI)

X-ray nanotomography and focused ion beam scanning electron microscopy (FIB-SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIB-SEM enable elemental mapping within the microstructure. Using these methods, non-destructive 3D x-ray imaging and FIB-SEM serial sectioning have been applied to compare three-dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

G Nelson; W Harris; J Lombardo; J Izzo Jr.; W Chiu; P Tanasini; M Cantoni; J Van herle; C Comninellis; et al.

2011-12-31T23:59:59.000Z

83

Scanning tunneling microscopy of charge density wave structure in 1T- TaS sub 2  

SciTech Connect

I have used a scanning tunneling microscope (STM) to image simultaneously the atomic lattice and the charge density wave (CDW) superstructure in tantalum disulfide (1T-TaS{sub 2}) over the temperature range of 370-77K. In the lowest temperature (commensurate) phase, present below 180K, the CDW is at an angle of 13.9{degrees} relative to the lattice and is uniformly commensurate. In the incommensurate phase, present above 353K, the CDW is aligned with the lattice. 1T-TaS{sub 2} exhibits two other phases; the triclinic (T) phase which is present between 223K and 283K upon warming the sample, and the nearly-commensurate (NC) phase which is present between 353K and 180K upon cooling the sample and between 283K and 353K upon warming the sample. In both of these phases, discommensurate models where the CDW is arranged in small commensurate domains have been proposed. In the NC phase the CDW is rotated between 10{degrees} and 12.5{degrees} relative to the atomic lattice. Such a rotated CDW would create an interference pattern with the underlying atomic lattice regardless of the existence of a true domain superstructure. Previous work on 1T-TaS{sub 2} has not adequately accounted for the possibility of this moire pattern. However, around each fundamental CDW peak in the Fourier transform of the real space STM images, several satellite spots are visible, which conclusively prove the existence of domains in the NC phase.

Thomson, R.E.

1991-11-01T23:59:59.000Z

84

Scanning tunneling microscopy of charge density wave structure in 1T- TaS{sub 2}  

SciTech Connect

I have used a scanning tunneling microscope (STM) to image simultaneously the atomic lattice and the charge density wave (CDW) superstructure in tantalum disulfide (1T-TaS{sub 2}) over the temperature range of 370-77K. In the lowest temperature (commensurate) phase, present below 180K, the CDW is at an angle of 13.9{degrees} relative to the lattice and is uniformly commensurate. In the incommensurate phase, present above 353K, the CDW is aligned with the lattice. 1T-TaS{sub 2} exhibits two other phases; the triclinic (T) phase which is present between 223K and 283K upon warming the sample, and the nearly-commensurate (NC) phase which is present between 353K and 180K upon cooling the sample and between 283K and 353K upon warming the sample. In both of these phases, discommensurate models where the CDW is arranged in small commensurate domains have been proposed. In the NC phase the CDW is rotated between 10{degrees} and 12.5{degrees} relative to the atomic lattice. Such a rotated CDW would create an interference pattern with the underlying atomic lattice regardless of the existence of a true domain superstructure. Previous work on 1T-TaS{sub 2} has not adequately accounted for the possibility of this moire pattern. However, around each fundamental CDW peak in the Fourier transform of the real space STM images, several satellite spots are visible, which conclusively prove the existence of domains in the NC phase.

Thomson, R.E.

1991-11-01T23:59:59.000Z

85

Scanning Electron Microscopy  

Science Conference Proceedings (OSTI)

... Bob Gordon of Hitachi explains that the electrons are produced by a tungsten filament, just like in an incandescent light bulb, but since the sample ...

2013-12-06T23:59:59.000Z

86

Scanning Tunneling Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Research Lab, MC 704 Urbana, IL 61801 217-244-4861 abbamont@illinois.edu Ian S. Anderson Oak Ridge National Laboratory Neutron Sciences Directorate P.O. Box 2008, MS 6477 Oak...

87

Atomic-resolution study of polarity reversal in GaSb grown on Si by scanning transmission electron microscopy  

SciTech Connect

The atomic-resolved reversal of the polarity across an antiphase boundary (APB) was observed in GaSb films grown on Si by high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The investigation of the interface structure at the origin of the APB reveals that coalescence of two domains with Ga-prelayer and Sb-prelayer causes the sublattice reversal. The local strain and lattice rotation distributions of the APB, attributed to the discordant bonding length at the APB with the surrounding GaSb lattice, were further studied using the geometric phase analysis technique. The crystallographic characteristics of the APBs and their interaction with other planar defects were observed with HAADF-STEM. The quantitative agreement between experimental and simulated images confirms the observed polarities in the acquired HAADF-STEM data. The self-annihilation mechanism of the APBs is addressed based on the rotation induced by anti-site bonds and APBs' faceting.

Hosseini Vajargah, S.; Woo, S. Y.; Botton, G. A. [Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Ghanad-Tavakoli, S. [Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Kleiman, R. N.; Preston, J. S. [Brockhouse Institute for Material Research, McMaster University, Hamilton, Ontario L8S 4M1 (Canada); Centre for Emerging Device Technologies, McMaster University, Hamilton, Ontario L8S 4L7 (Canada); Department of Engineering Physics, McMaster University, Hamilton, Ontario L8S 4L7 (Canada)

2012-11-01T23:59:59.000Z

88

Thermal heat radiation, near-field energy density and near-field radiative heat transfer of coated materials  

E-Print Network (OSTI)

We investigate the thermal radiation and thermal near-field energy density of a metal-coated semi-infinite body for different substrates. We show that the surface polariton coupling within the metal coating leads to an enhancement of the TM-mode part of the thermal near-field energy density when a polar substrate is used. In this case the result obtained for a free standing metal film is retrieved. In contrast, in the case of a metal substrate there is no enhancement in the TM-mode part, as can also be explained within the framework of surface plasmon coupling within the coating. Finally, we discuss the influence of the enhanced thermal energy density on the near-field radiative heat transfer between a simple semi-infinite and a coated semi-infinite body for different material combinations.

Biehs, Svend-Age

2011-01-01T23:59:59.000Z

89

Thermal heat radiation, near-field energy density and near-field radiative heat transfer of coated materials  

E-Print Network (OSTI)

We investigate the thermal radiation and thermal near-field energy density of a metal-coated semi-infinite body for different substrates. We show that the surface polariton coupling within the metal coating leads to an enhancement of the TM-mode part of the thermal near-field energy density when a polar substrate is used. In this case the result obtained for a free standing metal film is retrieved. In contrast, in the case of a metal substrate there is no enhancement in the TM-mode part, as can also be explained within the framework of surface plasmon coupling within the coating. Finally, we discuss the influence of the enhanced thermal energy density on the near-field radiative heat transfer between a simple semi-infinite and a coated semi-infinite body for different material combinations.

Svend-Age Biehs

2011-03-15T23:59:59.000Z

90

Combining In-Situ Buffer-Layer-Assisted-Growth with Scanning Probe Microscopy for Formation and Study of Supported Model Catalysts  

NLE Websites -- All DOE Office Websites (Extended Search)

STM images showing the morphology of BaO film (7 ML-left and STM images showing the morphology of BaO film (7 ML-left and 80 ML-right) formed by the direct evaporation of the BaO. EMSL Research and Capability Development Proposals Combining In Situ Buffer-Layer-Assisted-Growth with Scanning Probe Microscopy for Formation and Study of Supported Model Catalysts Project start date: Spring 2008 EMSL Lead Investigator: Igor Lyubinetsky Microscopy Group, EMSL, PNNL Co-investigators: Yingge Du Spectroscopy and Diffraction Group, EMSL, PNNL Wayne Goodman Department of Chemistry, Texas A&M University, College Station, Texas The objective of the project is to implement in situ advanced buffer-layer-assisted growth (BLAG) technique by combining EMSL's ultra-high vacuum scanning probe microscopy (UHV SPM) and

91

Near-field effects of asteroid impacts in deep water  

Science Conference Proceedings (OSTI)

Our previous work has shown that ocean impacts of asteroids below 500 m in diameter do not produce devastating long-distance tsunamis. Nevertheless, a significant portion of the ocean lies close enough to land that near-field effects may prove to be the greatest danger from asteroid impacts in the ocean. Crown splashes and central jets that rise up many kilometres into the atmosphere can produce, upon their collapse, highly non-linear breaking waves that could devastate shorelines within a hundred kilometres of the impact site. We present illustrative calculations, in two and three dimensions, of such impacts for a range of asteroid sizes and impact angles. We find that, as for land impacts, the greatest dangers from oceanic impacts are the short-term near-field, and long-term atmospheric effects.

Gisler, Galen R [Los Alamos National Laboratory; Weaver, Robert P [Los Alamos National Laboratory; Gittings, Micheal L [Los Alamos National Laboratory

2009-01-01T23:59:59.000Z

92

Modulation of near-field heat transfer between two gratings  

E-Print Network (OSTI)

We present a theoretical study of near-field heat transfer between two uniaxial anisotropic planar structures. We investigate how the distance and relative orientation (with respect to their optical axes) between the objects affect the heat flux. In particular, we show that by changing the angle between the optical axes it is possible in certain cases to modulate the net heat flux up to 90% at room temperature, and discuss possible applications of such a strong effect.

Svend-Age Biehs; Felipe S. S. Rosa; Philippe Ben-Abdallah

2011-05-18T23:59:59.000Z

93

Structure of Au on Ag(110) studied by scanning tunneling microscopy S. Chiang, S. Rousset,a) D. E. Fowler, and D. D. Chambliss  

E-Print Network (OSTI)

Structure of Au on Ag(110) studied by scanning tunneling microscopy S. Chiang, S. Rousset,a) D. E/12(3)/1747/4/$1.00 @1994 American Vacuum Society 1747 #12;1748 Chiang et 81.: Structure of Au on Ag(110) studied by STM Fll 10 min apart; #12;1749 Chiang et al.: Structure of Au on Ag(110) studied by STM FIG. 3. (a) -2 ML Au

Chiang, Shirley

94

Cryogenic apparatus for study of near-field heat transfer  

Science Conference Proceedings (OSTI)

For bodies spaced in vacuum at distances shorter than the wavelength of the thermal radiation, radiative heat transfer substantially increases due to the contribution of evanescent electromagnetic waves. Experimental data on heat transfer in near-field regime are scarce. We have designed a cryogenic apparatus for the study of heat transfer over microscopic distances between metallic and non-metallic surfaces. Using a mechanical positioning system, a planeparallel gap between the samples, concentric disks, each 35 mm in diameter, is set and varied from 10{sup 0} to 10{sup 3} {mu}m. The heat transferred from the hot (10 - 100 K) to the cold sample ({approx}5 K) sinks into a liquid helium bath through a thermal resistor, serving as a heat flux meter. Transferred heat power within {approx}2 nW/cm{sup 2} and {approx}30 {mu}W/cm{sup 2} is derived from the temperature drop along the thermal resistor. For tungsten samples, the distance of the near-field effect onset was inversely proportional to temperature and the heat power increase was observed up to three orders of magnitude greater than the power of far-field radiative heat transfer.

Kralik, T.; Hanzelka, P.; Musilova, V.; Srnka, A.; Zobac, M. [Institute of Scientific Instruments of the ASCR, v.v.i., Kralovopolska 147, Brno (Czech Republic)

2011-05-15T23:59:59.000Z

95

Determination of far-field antenna patterns from near-field measurements  

E-Print Network (OSTI)

Abstracf-In many cases, it is impractical or impossible to make antenna patfern measurements on a conventional far-field range; the distance to the radiating far field may be too long, it may be impractical to move the antenna from its operating environment to an antenna range, or the desired amount of pattern data may require too much time on a far-field range. For these and other reasons, it is often desirable or necessary to determine far-field antenna patterns from measurements made in the radiating near-field region; three basic techniques for accomplishing this have proven to be successful. In the 6rst technique, the aperture phase and amplitude distributions are sampled by a scanning field probe, and then the measured distributions are transformed to the far field. In the second technique, a plane wave that is approximately uniform in amplitude is created by a feed and large reflector in the immediate vicinity of the test antenna. And in the third technique, the test antenna is focused within the radiating near-field region, patterns are measured at the reduced range, and then the antenna is refocused to infinity. Each of these techniques is discussed, and the various advantages and limitations of each technique are presented.

Richard C. Johnson; H. Allen Ecrer; J. Searcy Hollis

1973-01-01T23:59:59.000Z

96

Relative humidity in the near-field environment  

SciTech Connect

The Yucca Mountain Site Characterization Project is investigating Yucca Mountain, Nevada, for its suitability as a potential repository for high-level nuclear wastes. United States federal regulation 10CFR60 requires that radioactive nuclides be substantially contained in waste packages for 300 to 1000 years after the emplacement. To meet the regulation, a waste package container should remain intact for several hundreds of years. It has been shown that high humidity increases the corrosion potential of metallic container materials. Relative humidity as a function of water saturation in intact rock is measured. The results of this test can be used to calibrate the relative humidity in the near-field environment predicted by model calculations using thermal-hydrological codes such as VTOUGH. This is a report on the progress of that experiment.

Lin, W.; Roberts, J.; Ruddle, D

1995-10-27T23:59:59.000Z

97

In-situ monitoring of electron beam induced deposition by atomic force microscopy in a scanning electron microscope  

Science Conference Proceedings (OSTI)

A new type of atomic force microscope is proposed for atomic force microscopic analysis inside a scanning electron microscope. We attached a piezoresisitive atomic force microscopic cantilever to a micro manipulator to achieve a compact and guidable ... Keywords: atomic force, electron beam induced deposition, in-situ monitoring, local gas injection, micro manipulator, microscope

S. Bauerdick; C. Burkhardt; R. Rudorf; W. Barth; V. Bucher; W. Nisch

2003-06-01T23:59:59.000Z

98

Near-field thermal radiation transfer controlled by plasmons in graphene  

E-Print Network (OSTI)

It is shown that thermally excited plasmon-polariton modes can strongly mediate, enhance, and tune the near-field radiation transfer between two closely separated graphene sheets. The dependence of near-field heat exchange ...

Ilic, Ognjen

99

Optical far-and near-field femtosecond laser ablation of Si for...  

NLE Websites -- All DOE Office Websites (Extended Search)

Optical far-and near-field femtosecond laser ablation of Si for nanoscale chemical analysis Title Optical far-and near-field femtosecond laser ablation of Si for nanoscale chemical...

100

INFLUENCE OF FILM STRUCTURE AND LIGHT ON CHARGE TRAPPING AND DISSIPATION DYNAMICS IN SPUN-CAST ORGANIC THIN-FILM TRANSISTORS MEASURED BY SCANNING KELVIN PROBE MICROSCOPY  

SciTech Connect

Herein, time-dependent scanning Kelvin probe microscopy of solution processed organic thin film transistors (OTFTs) reveals a correlation between film microstructure and OTFT device performance with the location of trapped charge within the device channel. The accumulation of the observed trapped charge is concurrent with the decrease in I{sub SD} during operation (V{sub G}=-40 V, V{sub SD}= -10 V). We discuss the charge trapping and dissipation dynamics as they relate to the film structure and show that application of light quickly dissipates the observed trapped charge.

Teague, L.; Moth, M.; Anthony, J.

2012-05-03T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


101

High resolution scanning tunnelling microscopy and extended x-ray-absorption fine structure study of the (533) silicide structure on Cu(001)  

E-Print Network (OSTI)

Using low energy electron diffraction (LEED), scanning tunnelling microscopy (STM) and x-ray absorption spectroscopy (XAS) techniques, we have studied the first steps of silicon adsorption onto Cu (001) single crystal substrate. For low coverage (~ 0.5 ML) and after annealing at 100{\\deg}C, STM images and LEED patterns reveal the formation of an ordered quasi commensurate superstructure. From a quantitative analysis of XAS data, we extract the Si-Cu distance and detail the local atomic arrangement of the structure.

B. Lalmi; M. Chorro; R. Belkhou

2013-08-09T23:59:59.000Z

102

Near-Field High Energy X-ray Diffraction Microscopy in Deformed ...  

Science Conference Proceedings (OSTI)

About this Abstract. Meeting, Materials Science & Technology 2012. Symposium, Quantification of Texture and Microstructure Gradients in Polycrystalline ...

103

Computer-Controlled Scanning Electron Microscopy (CCSEM) Investigation of Respirable Quartz in Air Samples Collected During Power Plant Maintenance Activities  

Science Conference Proceedings (OSTI)

Reliable methods of determining the amount of respirable, crystalline silica (quartz) in coal fly ash (CFA) are clearly of interest in order to satisfy Occupational Safety and Health Administration (OSHA) regulations and to accurately assess the potential risks of workers with prolonged CFA exposure to certain respiratory diseases. Earlier EPRI-sponsored research focused on development of a new method for determining the amount of respirable quartz in bulk CFA samples using computer-controlled scanning e...

2008-12-08T23:59:59.000Z

104

MML Microscopy Facility  

Science Conference Proceedings (OSTI)

The MML Electron Microscopy Facility consists of three transmission electron microscopes (TEM), three scanning electron microscopes (SEM), a ...

2013-06-11T23:59:59.000Z

105

Analytical Microscopy  

DOE Green Energy (OSTI)

In the Analytical Microscopy group, within the National Center for Photovoltaic's Measurements and Characterization Division, we combine two complementary areas of analytical microscopy--electron microscopy and proximal-probe techniques--and use a variety of state-of-the-art imaging and analytical tools. We also design and build custom instrumentation and develop novel techniques that provide unique capabilities for studying materials and devices. In our work, we collaborate with you to solve materials- and device-related R&D problems. This sheet summarizes the uses and features of four major tools: transmission electron microscopy, scanning electron microscopy, the dual-beam focused-ion-beam workstation, and scanning probe microscopy.

Not Available

2006-06-01T23:59:59.000Z

106

Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope  

SciTech Connect

We demonstrate that a transmission electron microscope fitted with two spherical-aberration correctors can be operated as an energy-filtered scanning confocal electron microscope. A method for establishing this mode is described and initial results showing 3D chemical mapping with nanoscale sensitivity to height and thickness changes in a carbon film are presented. Importantly, uncorrected chromatic aberration does not limit the depth resolution of this technique and moreover performs an energy-filtering role, which is explained in terms of a combined depth and energy-loss response function.

Wang Peng; Behan, Gavin; Kirkland, Angus I.; Nellist, Peter D. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Takeguchi, Masaki; Hashimoto, Ayako; Mitsuishi, Kazutaka [National Institute for Materials Science, 3-13 Sakura, Tsukuba, 305-0003 (Japan); Shimojo, Masayuki [Advanced Science Research Laboratory, Saitama Institute of Technology, 1690 Fusaiji, Fukaya 369-0293 (Japan)

2010-05-21T23:59:59.000Z

107

Results of a near field physical model study  

DOE Green Energy (OSTI)

A physical model study is ongoing to investigate the sensitivity of recirculation and near field plume dynamics to variation in OTEC plant design and ambient ocean conditions. A thermally-stratified 18 x 12 x 0.6 m basin at a nominal scale of 1/300 allows the upper 180 m of the ocean to be studied for plant sizes up to 600 MW(e). Tests have been conducted for stagnant conditions and for conditions with a current, using both the mixed discharge (combined evaporator and condenser) and non-mixed discharge concepts. Separate tests were made to investigate interactions between evaporator and condenser discharges in a non-mixed concept. Measurements include temperature, dye concentration, mean velocity and visual observations obtained from still and motion pictures. Results for the stagnant water tests showed no significant recirculation except for those tests where the discharge ports were oriented (slightly) upward or where the largest plant size (600 MW(e)) was tested. No significant difference in recirculation could be discerned between the mixed and the non-mixed discharge designs although differences in the equilibrium positions of the discharge plumes were noted. Tests in a current are still in progress but some preliminary results are presented.

Adams, E.E.; Fry, D.J.; Coxe, D.H.

1979-01-01T23:59:59.000Z

108

Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis  

Science Conference Proceedings (OSTI)

State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical mappings with excellent sensitivity and spatial resolution. Several important artifacts however arise from the fact that SIMS 3D mapping does not take into account the surface topography of the sample. In order to correct these artifacts, we have integrated a specially developed scanning probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new high-precision sample stage, a scanner with a range of 100 {mu}m in x and y direction, and a dedicated SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy modes. Topographical information gained from AFM measurements taken before, during, and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D reconstruction using the software program 'SARINA,' which was developed for this first combined SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMS-SPM approach.

Wirtz, Tom; Fleming, Yves; Gerard, Mathieu [Department 'Science and Analysis of Materials' (SAM), Centre de Recherche Public, Gabriel Lippmann, 41 rue du Brill, L-4422 Belvaux (Luxembourg); Gysin, Urs; Glatzel, Thilo; Meyer, Ernst [Department of Physics, Universitaet Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland); Wegmann, Urs [Department of Physics, Universitaet Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland); Ferrovac GmbH, Thurgauerstr. 72, CH-8050 Zuerich (Switzerland); Maier, Urs [Ferrovac GmbH, Thurgauerstr. 72, CH-8050 Zuerich (Switzerland); Odriozola, Aitziber Herrero; Uehli, Daniel [SPECS Zurich GmbH, Technoparkstr. 1, CH-8005 Zuerich (Switzerland)

2012-06-15T23:59:59.000Z

109

Scanning tunneling microscopy studies of the surfaces of a-Si:H and a-SiGe:H films  

SciTech Connect

The report contains a detailed description of the experimental complexities encountered in developing scanning tunneling microscope (STM) probing of atomic structure on the surface of freshly-grown hydrogenated-amorphous semiconductors. It also contains a speculative microscopic film-growth model that explains differences between the disorder in CVD grown a-Ge:H versus a-Si:H films. This model is derived from prior results obtained in the chemical analysis of GeH{sub 4} plasmas, combined with surface reaction and thermodynamic considerations. The neutral radical fragments of silane, disilane and germane dissociation in discharges, which dominate the vapor and film-growth reactions, have been deduced from detailed analysis of prior data and are reported. 4 refs., 7 figs.

Gallagher, A.; Ostrom, R.; Tannenbaum, D. (National Inst. of Standards and Technology, Boulder, CO (USA))

1991-06-01T23:59:59.000Z

110

Classification of Multiple Types of Organic Carbon Composition in Atmospheric Particles by Scanning Transmission X-Ray Microscopy Analysis  

Science Conference Proceedings (OSTI)

A scanning transmission X-ray microscope at the Lawrence Berkeley National Laboratory is used to measure organic functional group abundance and morphology of atmospheric aerosols. We present a summary of spectra, sizes, and shapes observed in 595 particles that were collected and analyzed between 2000 and 2006. These particles ranged between 0.1 and 12 mm and represent aerosols found in a large range of geographical areas, altitudes, and times. They include samples from seven different field campaigns: PELTI, ACE-ASIA, DYCOMS II, Princeton, MILAGRO (urban), MILAGRO (C-130), and INTEX-B. At least 14 different classes of organic particles show different types of spectroscopic signatures. Different particle types are found within the same region while the same particle types are also found in different geographical domains. Particles chemically resembling black carbon, humic-like aerosols, pine ultisol, and secondary or processed aerosol have been identified from functional group abundance and comparison of spectra with those published in the literature.

Kilcoyne, Arthur L; Takahama, S.; Gilardoni, S.; Russell, L.M.; Kilcoyne, A.L.D.

2007-05-16T23:59:59.000Z

111

Synchrotron radiation based cross-sectional scanning photoelectron microscopy and spectroscopy of n-ZnO:Al/p-GaN:Mg heterojunction  

Science Conference Proceedings (OSTI)

Al-doped ZnO (AZO) deposited by radio frequency co-sputtering is formed on epitaxial Mg-doped GaN template at room temperature to achieve n-AZO/p-GaN heterojunction. Alignment of AZO and GaN bands is investigated using synchrotron radiation based cross-sectional scanning photoelectron microscopy and spectroscopy on the nonpolar side-facet of a vertically c-axis aligned heterostructure. It shows type-II band configuration with valence band offset of 1.63 {+-} 0.1 eV and conduction band offset of 1.61 {+-} 0.1 eV, respectively. Rectification behavior is clearly observed, with a ratio of forward-to-reverse current up to six orders of magnitude when the bias is applied across the p-n junction.

Lee, Kai-Hsuan; Chen, Chia-Hao [Nano Science Group, National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan (China)] [Nano Science Group, National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan (China); Chang, Ping-Chuan [Department of Electro-Optical Engineering, Kun Shan University, Dawan Rd. 949, 71003 Tainan, Taiwan (China)] [Department of Electro-Optical Engineering, Kun Shan University, Dawan Rd. 949, 71003 Tainan, Taiwan (China); Chen, Tse-Pu; Chang, Sheng-Po; Chang, Shoou-Jinn [Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, University Rd. 1, 70101 Tainan, Taiwan (China)] [Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, University Rd. 1, 70101 Tainan, Taiwan (China); Shiu, Hung-Wei; Chang, Lo-Yueh [Nano Science Group, National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan (China) [Nano Science Group, National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan (China); Department of Physics, National Tsing Hua University, Kuang-Fu Rd. 101, 30013 Hsinchu, Taiwan (China)

2013-02-18T23:59:59.000Z

112

Report on Modeling Coupled Processes in the Near Field of a Clay...  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

Report on Modeling Coupled Processes in the Near Field of a Clay Repository Clayshale has been considered as potential host rock for geological disposal of high-level...

113

Ion energy and plasma measurements in the near field of an ICRF antenna  

SciTech Connect

Plasma properties and ion energies have been measured in the near field of an ICRF antenna to determine the effects of rf fields in a magnetized plasma sheath on the energy of ions incident on the surface of the Faraday shield. A resonant loop antenna with a two- tier Faraday shield was used on the RF Test Facility at Oak Ridge National Laboratory (ORNL). The magnetic field near the antenna is /approximately/2 kG, and the plasma density is /approximately/10/sup 11/ cm/sup /minus/3/ with an electron temperature of 6-10 eV. The time-varying floating potential was measured with a capacitively coupled probe, and the time-averaged electron temperature, electron density, and floating potential were measured with a Langmuir probe. Both probes were scanned poloidally in front of the antenna, parallel to the current strap. Diagnostics for measuring ion energies included a gridded energy analyzer located directly below the antenna. Measured ion energies are compared with predictions from a computational model for determining the energy and angular distribution of ions incident on a surface in a magnetized plasma sheath with a time-varying plasma potential. 7 refs., 3 figs.

Caughman, J.B.O. II; Ruzic, D.N.; Hoffman, D.J.

1989-01-01T23:59:59.000Z

114

Anomalous Near-Field Heat Transfer between a Cylinder and a Perforated Surface  

E-Print Network (OSTI)

We predict that the near-field radiative heat-transfer rate between a cylinder and a perforated surface depends nonmonotonically on their separation. This anomalous behavior, which arises due to evanescent-wave effects, ...

Rodriguez-Wong, Alejandro

115

Research and Analysis on Piezoelectric Properties of Near-field Electrospinning PVDF Nanofiber.  

E-Print Network (OSTI)

??In this study, with near-field electrospinning technique of PVDF (Polyvinylidene fluoride) piezoelectric nano-fibers and the additional multiwalled-carbon nanotubes(MWCNT), both mechanical strength and piezoelectric characteristics of… (more)

Lai, Hao-Wei

2011-01-01T23:59:59.000Z

116

Three-dimensional near-field microwave holography for tissue imaging  

Science Conference Proceedings (OSTI)

This paper reports the progress toward a fast and reliable microwave imaging setup for tissue imaging exploiting near-field holographic reconstruction. The setup consists of two wideband TEM horn antennas aligned along each other's boresight and performing ...

Reza K. Amineh; Ali Khalatpour; Haohan Xu; Yona Baskharoun; Natalia K. Nikolova

2012-01-01T23:59:59.000Z

117

Magnetic anisotropy in a permalloy microgrid fabricated by near-field optical lithography  

Science Conference Proceedings (OSTI)

We report the fabrication and magnetic properties of permalloy microgrids prepared by near-field optical lithography and characterized using high-sensitivity magneto-optical Kerr effect techniques. A fourfold magnetic anisotropy induced by the grid architecture is identified.

S. P. Li; A. Lebib; D. Peyrade; M. Natali; Y. Chen; W. S. Lew; J. A. C. Bland

2001-01-01T23:59:59.000Z

118

An Overview of near-field vs. far-field radiation characteristics of the Linac Coherent Light Sources (LCLS)  

E-Print Network (OSTI)

An Overview of near-field vs. far-field radiation characteristics of the Linac Coherent Light Sources (LCLS)

Tatchyn, R

2005-01-01T23:59:59.000Z

119

Aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy studies of epitaxial Fe/MgO/(001)Ge heterostructures  

SciTech Connect

Aberration correction in the scanning transmission electron microscope combined with electron energy loss spectroscopy allows simultaneous mapping of the structure, the chemistry and even the electronic properties of materials in one single experiment with spatial resolutions of the order of one Angstrom. Here the authors will apply these techniques to the characterization of epitaxial Fe/MgO/(001)Ge and interfaces with possible applications for tunneling junctions, and the authors will show that epitaxial MgO films can be grown on a (001)Ge substrates by molecular beam epitaxy and how it is possible to map the chemistry of interfaces with atomic resolution. Epitaxial growth of insulator oxides on semiconductors constitutes a key issue within the field of electronics, and a considerably large effort has been devoted to harness the growth of high-k oxides on Si. Ge, due to its high electronic and hole mobility, is a very interesting alternative as a potential substrate for future high performance complementary metal-oxide-semiconductor field-effect transistors. However, a major issue is to avoid the high resistivity at the source and drain contacts ensuing from the pinning of the Fermi level at the valence-band maximum. It has been suggested that this problem could be fixed by depositing a thin insulating tunneling barrier between the Ge substrate and the metal contacts. In this case, single crystal epitaxy would represent an additional benefit, since it would lead to a reduction of interfacial defects and improved performance of the tunneling barrier. MgO has been suggested to fulfill such requisites. Furthermore, MgO has been demonstrated to be a good substrate for epitaxial growth of transition metals thin films, such as Fe and Co, thus avoiding the potential problem of chemical reactivity with Ge. In such a scenario, epitaxial deposition of high quality MgO films on Ge substrates is highly desirable. But in addition, successful epitaxial growth of MgO on a semiconductor would also constitute a plus for applications in spintronics, since the injection of a spin polarized current from a ferromagnetic electrode to a non-magnetic semiconductor requires the presence of a potential barrier. MgO represents a convenient choice because the symmetry filtering properties at the interface with transition metals would allow an efficient spin filtering effect. For this approach to succeed, a suitable semiconducting substrate where MgO can be grown epitaxially must be found. And again, while GaAs and Si have been investigated for such role, Ge has not received much attention so far. In this study the authors report on the atomic resolution characterization of high quality interfaces in Fe/MgO/(001)Ge heterostructures. The study of the defects, the inhomogeneities and the interface structure of such junctions is a must to pave the way toward future applications. For this aim, the combination of scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) is a most useful tool, since it allows these features to be probed with atomic resolution. Spherical aberration correction in the STEM allows for increased contrast, allowing even single atoms to be detected both in imaging and spectroscopy.

Gazquez Alabart, Jaume [ORNL; Varela del Arco, Maria [ORNL; Petti, D. [Politecnico di Milano; Cantoni, M. [Politecnico di Milano; Rinaldi, C. [Politecnico di Milano; Brivio, S. [Politecnico di Milano; Bertacco, R. [Politecnico di Milano

2011-01-01T23:59:59.000Z

120

EMSL: Capabilities: Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscopy Microscopy Additional Information Meet the Microscopy Experts Related EMSL User Projects Microscopy Tools are Applied to all Science Themes Watch the Microscopy capability video on EMSL's YouTube channel and read the transcript. Microscopy brochure Quiet Wing brochure EMSL hosts a variety of sophisticated microscopy instruments, including electron microscopes, optical microscopes, scanning probe microscopes, and computer-controlled microscopes for automated particle analysis. These tools are used to image a range of sample types with nanoscale-and even atomic-resolution with applications to surface, environmental, biogeochemical, atmospheric, and biological science. Each state-of-the-art instrument and customized capability is equipped with features for specific

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


121

Report on Modeling Coupled Processes in the Near Field of a Clay Repository  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

on Modeling Coupled Processes in the Near Field of a Clay on Modeling Coupled Processes in the Near Field of a Clay Repository Report on Modeling Coupled Processes in the Near Field of a Clay Repository Clay/shale has been considered as potential host rock for geological disposal of high-level radioactive waste throughout the world. Coupled thermal, hydrological, mechanical, and chemical (THMC) processes have a significant impact on the long-term safety of a clay repository. This report documents results from three R&D activities: (1) implementation and validation of constitutive relationships, (2) development of a discrete fracture network (DFN) model for investigating coupled processes in the excavation damaged zone, and (3) development of a THM model for the Full-Scale Emplacement Experiment tests at Mont Terri, Switzerland, for the

122

An evaluation of near-field host rock temperatures for a spent fuel repository  

SciTech Connect

A repository heat transfer analysis has been performed by the Pacific Northwest Laboratory (PNL) for the US Department of Energy's Performance Assessment Scientific Support Program. The objective of this study was to evaluate the near-field thermal environmental conditions for a spent fuel repository system. A spent fuel logistics analysis was performed using a waste management system simulation model, WASTES-II, to evaluate the thermal characteristics of spent fuel received at the repository. A repository-scale thermal analysis was performed using a finite difference heat transfer code, TEMPEST, to evaluate the near-field host rock temperature. The calculated temporal and spatial distributions of near-field host rock temperatures provide input to the repository source term model in evaluations of engineered barrier system performance. 9 refs., 10 figs., 2 tabs.

Altenhofen, M.K.; Lowery, P.S.

1988-11-01T23:59:59.000Z

123

Report on THMC Modeling of the Near Field Evolution of a Generic Clay  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

on THMC Modeling of the Near Field Evolution of a Generic on THMC Modeling of the Near Field Evolution of a Generic Clay Repository: Model Validation and Demonstration Rev 2 Report on THMC Modeling of the Near Field Evolution of a Generic Clay Repository: Model Validation and Demonstration Rev 2 Shale and clay-rich rock formations have been considered as potential host rocks for geological disposal of high-level radioactive waste throughout the world. Coupled thermal, hydrological, mechanical, and chemical (THMC) processes have a significant impact on the long-term safety of a repository in this type of rocks. The validity of the two-part Hooke's model (TPHM), a new constitutive relationship, and associated formulations regarding rock hydraulic/mechanical properties is demonstrated by the consistency between observations from a mine-by test at the Mont Terri site

124

Near field and altered zone environmental report Volume I: technical bases for EBS design  

SciTech Connect

This report presents an updated summary of results for the waste package (WP) and engineered barrier system (EBS) evaluations, including materials testing, waste-form characterization, EBS performance assessments, and near-field environment (NFE) characterization. Materials testing, design criteria and concept development, and waste-form characterization all require an understanding of the environmental conditions that will interact with the WP and EBS. The Near-Field Environment Report (NFER) was identified in the Waste Package Plan (WPP) (Harrison- Giesler, 1991) as the formal means for transmitting and documenting this information.

Wilder, D. G., LLNL

1997-08-01T23:59:59.000Z

125

Magnetic anisotropy in a permalloy microgrid fabricated by near-field optical lithography  

Science Conference Proceedings (OSTI)

We report the fabrication and magnetic properties of permalloy microgrids prepared by near-field optical lithography and characterized using high-sensitivity magneto-optical Kerr effect techniques. A fourfold magnetic anisotropy induced by the grid architecture is identified. {copyright} 2001 American Institute of Physics.

Li, S. P.; Lebib, A.; Peyrade, D.; Natali, M.; Chen, Y.; Lew, W. S.; Bland, J. A. C.

2001-07-01T23:59:59.000Z

126

Near-field scattering from red pigment particles: Absorption and spectral dependence  

E-Print Network (OSTI)

cornea,5 the effi- ciency of phosphors,6 and the appearance of reflective dis- play materials,7 paint,8Near-field scattering from red pigment particles: Absorption and spectral dependence L. E. Mc of pigment particles embedded in a transparent resin, the optical characteristics of the resulting film

French, Roger H.

127

Graphene-based photovoltaic cells for near-field thermal energy conversion  

E-Print Network (OSTI)

Graphene-based photovoltaic cells for near-field thermal energy conversion Riccardo Messina to a photovoltaic cell can be largely enhanced because of the contribution of evanescent photons, in particular important source of energy. By approaching a photovoltaic (PV) cell3 in proximity of a thermal emitter

Paris-Sud XI, Université de

128

Compact UWB probe for near-field microwave target detection and imaging  

Science Conference Proceedings (OSTI)

The numerical analysis and experimental characterization of an ultra-wideband (UWB) probe designed for near-field target detection and imaging are reported. The configuration, based on transverse electromagnetic (TEM) horn, has two curved launching planes ... Keywords: probe, resistive load, transverse electromagnetic (TEM) horn, ultra-wideband (UWB)

Jing Xia; Wa Kong; Gang Wang

2009-09-01T23:59:59.000Z

129

Facet-Specific Chemistry of Noble Metal Nanoparticles Using an Enhanced Scattering Infrared Scanning Near-Field Optical Microscope  

E-Print Network (OSTI)

of refraction measurements position capability for Department of Homeland Security, National Nuclear Security in catalytic transformations, aerosol characterization, and national security Apply technique to catalytic

130

April Conferences Focus on Scanning Advances  

Science Conference Proceedings (OSTI)

... of the scanning electron microscope (SEM) in ... and helium ion microscopes— have unlocked ... of SEM, scanning ion microscopy, quality assurance in ...

2011-07-19T23:59:59.000Z

131

A Case for Employing Near-field Measurements to Detect Important Effluents from Nuclear Material Processing Operations  

Science Conference Proceedings (OSTI)

General discussion of effluents from nuclear material reprocessing operations and the opportunity to detect important effluents in the near-field domain.

Hartman, John S.; Kelly, James F.; Birnbaum, Jerome C.

2007-01-31T23:59:59.000Z

132

Super-Planckian Near-Field Thermal Emission with Phonon-Polaritonic Hyperbolic Metamaterials  

E-Print Network (OSTI)

We study super-Planckian near-field heat exchanges for multilayer hyperbolic metamaterials using exact S-matrix calculations. We investigate heat exchanges between two multilayer hyperbolic metamaterial structures. We show that the super- Planckian emission of such metamaterials can either come from the presence of surface phonon-polaritons modes or from a continuum of hyperbolic modes depending on the choice of composite materials as well as the structural configuration.

Biehs, Svend-Age; Messina, Riccardo; Ben-Abdallah, Philippe

2013-01-01T23:59:59.000Z

133

A Networked Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

Featured Overview. A New Paradigm—Multi-User Scanning Electron Microscopy. L.S. Chumbley, M. Meyer, K. Fredrickson, and F.C. Laabs. Introduction; System ...

134

Basic Design of the Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

...H.E. Exner and S. Weinbruch, Scanning Electron Microscopy, Metallography and Microstructures, Vol 9, ASM Handbook,

135

Advantages of Integrating Precession Scanning Transmission ...  

Science Conference Proceedings (OSTI)

Presentation Title, Advantages of Integrating Precession Scanning Transmission Electron Microscopy in the Characterization of Metallic Materials. Author(s) ...

136

Near-field enhancement of metal nano-particle based on the light focusing by the micro-parabolic mirror  

E-Print Network (OSTI)

Near-field enhancement of metal nano-particle based on the light focusing by the micro-parabolic mirror , , , , Abstract We propose to use a micro-parabolic mirror, in order to improve the near- parabolic mirror, the mirror-reflected light can be efficiently transformed into the near-field of the nano

Park, Namkyoo

137

Electron Microscopy (EM, TEM, SEM, STEM) Information at ...  

Science Conference Proceedings (OSTI)

... Electron holography. Electron Microscopy of Carbon Nanotube Composites. Environmental Scanning Electron Microscope. ...

2010-10-05T23:59:59.000Z

138

End station for nanoscale magnetic materials study: Combination of scanning tunneling microscopy and soft X-ray magnetic circular dichroism spectroscopy  

SciTech Connect

We have constructed an end station for nanoscale magnetic materials study at the soft X-ray beamline HiSOR BL-14 at Hiroshima Synchrotron Radiation Center. An ultrahigh-vacuum scanning tunneling microscope (STM) was installed for an in situ characterization of nanoscale magnetic materials in combination with soft X-ray magnetic circular dichroism (XMCD) spectroscopy experiment. The STM was connected to the XMCD experimental station via damper bellows to isolate it from environmental vibrations, thus achieving efficient spatial resolution for observing Si(111) surface at atomic resolution. We performed an in situ experiment with STM and XMCD spectroscopy on Co nanoclusters on an Au(111) surface and explored its practical application to investigate magnetic properties for well-characterized nanoscale magnetic materials.

Ueno, Tetsuro; Sawada, Masahiro; Namatame, Hirofumi [Hiroshima Synchrotron Radiation Center, Hiroshima University, 2-313 Kagamiyama, Higashi-Hiroshima 739-0046 (Japan); Kishimizu, Yusuke; Kimura, Akio [Graduate School of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); Taniguchi, Masaki [Hiroshima Synchrotron Radiation Center, Hiroshima University, 2-313 Kagamiyama, Higashi-Hiroshima 739-0046 (Japan); Graduate School of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan)

2012-12-15T23:59:59.000Z

139

Influence of roughness on near-field heat transfer between two plates  

E-Print Network (OSTI)

The surface roughness correction to the near-field heat transfer between two rough bulk materials is discussed by using second-order perturbation theory. The results allow for estimating the impact of surface roughness to the heat transfer in recent experiments between two plates and between a microsphere and a plate (using the Derjaguin approximation). Furthermore, we show that the proximity approximation for describing rough surfaces is valid for distances much smaller than the correlation length of the surface roughness even if the heat transfer is dominated by the coupling of surface modes.

Svend-Age Biehs; Jean-Jacques Greffet

2011-03-11T23:59:59.000Z

140

Dielectric microscopy with submillimeter resolution  

E-Print Network (OSTI)

In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying dielectric properties of materials with sub-wavelength resolution; using a 150 GHz probe in transmision mode we see spatial resolution of around 500 microns. We have applied this method to a variety of highly heterogeneous materials. Here we show dielectric maps of granite and oil shale.

Nathan S. Greeney; John A. Scales

2007-06-20T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


141

In situ investigation of ion-induced dewetting of a thin iron-oxide film on silicon by high resolution scanning electron microscopy  

SciTech Connect

Using our new in situ high resolution scanning electron microscope, which is integrated into the UNILAC ion beamline at the Helmholtzzentrum fuer Schwerionenforschung (GSI) in Darmstadt, Germany, we investigated the swift heavy ion induced dewetting of a thin iron oxide layer on Si. Besides heterogeneous hole nucleation at defects and spontaneous (homogeneous) hole nucleation, we could clearly identify a dewetting mechanism, which is similar to the spinodal dewetting observed for liquid films. Instead of being due to capillary waves, it is based on a stress induced surface instability. The latter results in the formation of a wavy surface with constant dominant wave-length and increasing amplitude during ion irradiation. Dewetting sets in as soon as the wave-troughs reach the film-substrate interface. Inspection of the hole radii and rim shapes indicates that removal of the material from the hole area occurs mainly by plastic deformation at the inner boundary and ion induced viscous flow in the peripheral zone due to surface tension.

Amirthapandian, S. [Institut fuer Halbleiteroptik und Funktionelle Grenzflaechen, Universitaet Stuttgart, 70569 Stuttgart (Germany); Material Physics Division, Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India); Schuchart, F.; Garmatter, D.; Bolse, W. [Institut fuer Halbleiteroptik und Funktionelle Grenzflaechen, Universitaet Stuttgart, 70569 Stuttgart (Germany)

2012-11-15T23:59:59.000Z

142

Near-field characterization of hydrogen and helium operation on the TFTR diagnostic neutral beam  

DOE Green Energy (OSTI)

An optical multichannel analyzer has been used to measure beam divergence and composition. This measurement is usually performed near the center of the neutralizer or beyond the magnet. In the past, these locations suffered difficult beam composition analysis and low light intensity, respectively. It has been determined that the light emission is relatively independent of neutralizer line density in the near field, allowing near-field measurements to overcome both difficulties. At optimum perveance, but under conditions of high gas throughput, the helium 1/{ital e} divergence angle was measured to be 1.5{degree}. Further investigation found that the divergence decreased with gas throughput down to 1.25{degree}. Minimum divergences for the full-, half-, and third-energy hydrogen components were 1.1{degree}, 1.2{degree}, and 1.4{degree}, respectively. Relative neutral hydrogen particle fluxes available for injection into TFTR are a function of perveance. At maximum perveance, the full-, half-, and third-energy atom fractions were 0.25{plus minus}0.04, 0.5{plus minus}0.04, and 0.25{plus minus}0.05, respectively.

Kamperschroer, J.H.; Schilling, G.; Roquemore, A.L. (Princeton Plasma Physics Laboratory, Princeton University, Princeton, NJ (USA))

1990-10-01T23:59:59.000Z

143

Apparatus comprising a tunable nanomechanical near-field grating and method for controlling far-field emission  

SciTech Connect

A tunable nanomechanical near-field grating is disclosed which is capable of varying the intensity of a diffraction mode of an optical output signal. The tunable nanomechanical near-field grating includes two sub-gratings each having line-elements with width and thickness less than the operating wavelength of light with which the grating interacts. Lateral apertures in the two sub-gratings are formed from the space between one line-element of the first sub-grating and at least one line-element of the second sub-grating. One of the sub-gratings is capable of motion such that at least one of aperture width and aperture depth changes, causing a perturbation to the near-field intensity distribution of the tunable nanomechanical near-field grating and a corresponding change to the far-field emission of thereof.

Carr, Dustin Wade (Albuquerque, NM); Bogart, Gregory Robert (Corrales, NM)

2007-02-06T23:59:59.000Z

144

Piezoelectricity of hollow cylindrical near-field electrospinning PBLG fiber arrays for energy harvesting from biological flight.  

E-Print Network (OSTI)

??In this study, a cylindrical near-field electrospinning (CNFES) process and the Taguchi methods were used to fabricate permanent piezoelectricity of poly(Îł-benzyl α, L-glutamate) (PBLG) piezoelectric… (more)

Li, Hui-wen

2013-01-01T23:59:59.000Z

145

Novel Approaches to Soft X-ray Spectroscopy: Scanning TransmissionX-ray Microscopy and Ambient Pressure X-Ray PhotoelectronSpectroscopy  

Science Conference Proceedings (OSTI)

This workshop focused on novel spectroscopies at Beamlines 11.0.2, 5.3.2 and 9.3.2 at the ALS. The workshop brought together users from a wide range of fields to highlight recent experimental and technical developments both in scanning transmission X-ray spectroscopy (STXM) and ambient pressure photoelectron spectroscopy (APPES). The morning session featured talks on experiments involving new developments at the STXM, while the afternoon session was devoted to those using APXPS. In the morning session, Tolek Tyliszczak discussed the improved detector developments at the STXM, such as an avalanche photodiode detector and fluorescence and electron detection, as well as the continued development of in situ cells for heating, gas flow, and electrochemical cells. Of these, only the avalanche photodiode in combination with a novel multichannel photon-counting system is in routine use in time-resolved studies. Bartel Van Waeyenberge (Ghent University) presented results of magnetic imaging with a time resolution of 70-100 ps combined with a lateral resolution of 20-40 nm performed with the STXM (Beamline 11.0.2). As a complement to the time-domain ''pump-and-probe'' measurements, they developed a frequency-domain ''sine-excitation'' technique in order to study specific eigenmodes of these ferromagnetic patterns with high spatial resolution. This new approach was used to study the gyrotropic vortex motions in micron-sized ferromagnetic patterns. Adam Hitchcock (McMaster University) presented the development, in collaboration with Daniel Guay (INRS, Varennes) and Sherry Zhang, of the apparatus and techniques for applying STXM to in-situ studies of electrochemistry, in particular electrochromism in polyaniline. In addition, substantial progress was reported on a joint project to develop substrates and methods for chemically selective lithography of multilayer polymer systems. Selective patterns, such as that displayed in the figure, can now be written efficiently with the bend magnet STXM on Beamline 5.3.2. Yves Acremann (SSRL) discussed time and spatially resolved X-ray magnetic circular dichroism (XMCD) experiments on spin transfer devices at the STXM (Beamline 11.0.2). These elegant experiments explore time resolved measurements of the magnetization dynamics within a 100 x 150 nm sample influenced by a spin-polarized current. This experiment shows that the magnetization in these magnetic nanostructures are not uniform, as they are influenced by the Oersted field of the charge current needed to generate the spin current. The implementation of a novel multichannel photon counting system in combination with an avalanche photon detector decreased the data-acquisition time by a factor of 10, owing to its ability to resolve the structure of multi bunch mode. Gordon E. Brown, Jr. (Stanford University and SSRL) described ''Applications of STXM to Microbial Bioweathering and Biomineralization''. In the interaction of bacteria with ferrihydrite nanoparticles, microenvironments that were very different than the bulk material were observed, showing that bulk thermodynamics may not be useful for predicting micro phases. Gordon also presented work showing that iron nanoparticles are attracted to the negatively charged bacteria and form a coating that reduces iron oxide minerals. The afternoon session started with presentations by Simon Mun and Hendrik Bluhm, who discussed the current status and the future plans for the two APPES end-stations at the ALS, which are located at Beamlines 9.3.2 and 11.0.2, respectively. In both end-stations, samples can be measured in gaseous environments at pressures of up to several Torr, which makes possible the investigation of numerous phenomena, in particular in the fields of atmospheric and environmental science as well as heterogeneous catalysis. Specific examples of the application of APPES were shown in the following presentations. John Hemminger (University of California, Irvine) reported on APPES investigations at Beamlines 9.3.2 and 11.0.2 of the interaction of alkali halide surfaces with water. The m

Bluhm, Hendrik; Gilles, Mary K.; Mun, Simon B.; Tyliszczak, Tolek

2006-02-01T23:59:59.000Z

146

Graphene-based photovoltaic cells for near-field thermal energy conversion  

E-Print Network (OSTI)

Thermophotovoltaic devices are energy-conversion systems generating an electric current from the thermal photons radiated by a hot body. In far field, the efficiency of these systems is limited by the thermodynamic Schockley-Queisser limit corresponding to the case where the source is a black body. On the other hand, in near field, the heat flux which can be transferred to a photovoltaic cell can be several orders of magnitude larger because of the contribution of evanescent photons. This is particularly true when the source supports surface polaritons. Unfortunately, in the infrared where these systems operate, the mismatch between the surface-mode frequency and the semiconductor gap reduces drastically the potential of this technology. Here we show that graphene-based hybrid photovoltaic cells can significantly enhance the generated power paving the way to a promising technology for an intensive production of electricity from waste heat.

Riccardo Messina; Philippe Ben-Abdallah

2012-07-05T23:59:59.000Z

147

Near-field heat transfer between a nanoparticle and a rough surface  

E-Print Network (OSTI)

In this work we focus on the surface roughness correction to the near-field radiative heat transfer between a nanoparticle and a material with a rough surface utilizing a direct perturbation theory up to second order in the surface profile. We discuss the different distance regimes for the local density of states above the rough material and the heat flux analytically and numerically. We show that the heat transfer rate is larger than that corresponding to a flat surface at short distances. At larger distances it can become smaller due to surface polariton scattering by the rough surface. For distances much smaller than the correlation length of the surface profile, we show that the results converge to a proximity approximation, whereas in the opposite limit the rough surface can be replaced by an equivalent surface layer.

Svend-Age Biehs; Jean-Jacques Greffet

2011-03-11T23:59:59.000Z

148

Near-Field Hydrology Data Package for the Immobilized Low-Activity Waste 2001 Performance Assessment  

SciTech Connect

Lockheed Martin Hanford Company (LMHC) is designing and assessing the performance of disposal facilities to receive radioactive wastes that are currently stored in single- and double-shell tanks at the Hanford Site. The preferred method for disposing of the portion that is classified as immobilized low-activity waste (ILAW) is to vitrify the waste and place the product in new-surface, shallow land burial facilities. The LMHC project to assess the performance of these disposal facilities is the Hanford ILAW Performance Assessment (PA) Activity. The goal of this project is to provide a reasonable expectation that the disposal of the waste is protective of the general public, groundwater resources, air resources, surface water resources, and inadvertent intruders. Achieving this goal will require prediction of contaminant migration from the facilities. This migration is expected to occur primarily via the movement of water through the facilities and the consequent transport of dissolved contaminants in the pore water of the vadose zone. Pacific Northwest National Laboratory (PNNL) assists LMHC in its performance assessment activities. One of PNNL's tasks is to provide estimates of the physical, hydraulic, and transport properties of the materials comprising the disposal facilities and the disturbed region around them. These materials are referred to as the near-field materials. Their properties are expressed as parameters of constitutive models used in simulations of subsurface flow and transport. In addition to the best-estimate parameter values, information on uncertainty in the parameter values and estimates of the changes in parameter values over time are required to complete the PA. These parameter estimates and information are contained in this report, the Near-Field Hydrology Data Package.

PD Meyer; RJ Serne

1999-12-21T23:59:59.000Z

149

Scanned Probe Microscopy Measurements and Standards  

Science Conference Proceedings (OSTI)

... enable high-throughput quantification for gas absorption in energy materials for two important tasks: hydrogen storage and carbon sequestration. ...

2013-03-15T23:59:59.000Z

150

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

8.31.2013 Seminar presented at Ohio University APS From August 28-30, 2013, Volker Rose was invited by Prof. Saw-Wai Hla for a research visit at Ohio University (OU). Ohio...

151

Designing Advanced Scanning Probe Microscopy Instruments  

Science Conference Proceedings (OSTI)

... The UHV insert is cooled via He exchange gas to avoid vibrations from the boiling of the liquid He in the main bath of the cryostat. ...

2011-09-22T23:59:59.000Z

152

Scanning electron microscopy imaging of hydraulic cement ...  

Science Conference Proceedings (OSTI)

... Cement clinker is manufactured from a finely-ground, homogenized blend of limestone, shale and iron ore sintered in a rotary kiln to temperatures ...

2004-11-23T23:59:59.000Z

153

Scanning Electron Microscopy Education Outreach Program  

Science Conference Proceedings (OSTI)

May 1, 2007 ... TMS Member price: 10.00. Non-member price: 25.00. TMS Student Member price : 10.00. Product In Stock. Description This paper describes an ...

154

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

(September 30, 2013) Shirato presents invited talk at SPIE conference (September 02, 2013) August Seminar presented at Ohio University (August 31, 2013) Training...

155

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

Beamtime 2013 APS | SXSPM | Beamtime 2013 Downlaod PDF SXSPM | Beamtime 2012 APS | SXSPM | Beamtime 2012 Downlaod PDF...

156

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

16.2013 Training next-generation scientists at NX School APS The twelfth annual National Neutron and X-ray Scattering School took place from August 10-24, 2013 at Argonne and Oak...

157

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

02.2013 Shirato presents invited talk at SPIE conference APS The 2013 SPIE Optics and Photonics conference was held at San Diego Convention Center from August 25-29, 2013. It is...

158

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

7.08.2013 Visiting graduate student Jan Meyburg spends summer at Argonne APS Jan Philipp Meyburg is a graduate student in chemistry at the University of Duisburg-Essen. He joins...

159

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

30.2013 Alan Alda Center for Communicating Science workshop APS APS On September 26-28, 2013, Alan Alda, The Kavli Foundation, and the Alan Alda Center for Communicating Science...

160

Advanced Photon Source | Combining Scanning Probe Microscopy...  

NLE Websites -- All DOE Office Websites (Extended Search)

Presentations UPCOMING PRESENTATIONS V. Rose, The Institute for Solid State Physics Nano Science Seminar (Invited Speaker) The University of Tokyo, Japan (October 31-November 2,...

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161

Aberration-Corrected Scanning Transmission Electron Microscopy ...  

Science Conference Proceedings (OSTI)

... hydrogen production by steam reforming of methanol and oxidation of CO for low ... Recent Developments in In Situ Studies of Catalytic Materials at Atomic ...

162

Scanning He Ion Beam Microscopy and Metrology  

Science Conference Proceedings (OSTI)

... Damage to polymers is less severe ... 29 Charging is controlled by an electron flood gun aimed at the specimen – ... polymer film even at low doses ...

2011-10-03T23:59:59.000Z

163

Nanomechanical near-field grating apparatus and acceleration sensor formed therefrom  

DOE Patents (OSTI)

A nanomechanical near-field grating device is disclosed which includes two sub-gratings vertically spaced by a distance less than or equal to an operating wavelength. Each sub-grating includes a plurality of line-elements spaced apart by a distance less than or equal to the operating wavelength. A light source (e.g., a VCSEL or LED) can provide light at the operating wavelength for operation of the device. The device can operate as an active grating, with the intensity of a reflected or transmitted portion of the light varying as the relative positions of the sub-gratings are controlled by an actuator. The device can also operate as a passive grating, with the relative positions of the sub-gratings changing in response to an environmentally-induced force due to acceleration, impact, shock, vibration, gravity, etc. Since the device can be adapted to sense an acceleration that is directed laterally or vertically, a plurality of devices can be located on a common substrate to form a multi-axis acceleration sensor.

Carr, Dustin Wade (Albuquerque, NM); Bogart, Gregory Robert (Corrales, NM); Keeler, Bianca E. N. (Albuquerque, NM)

2008-03-04T23:59:59.000Z

164

Epitaxial BaTiO{sub 3}(100) films on Pt(100): A low-energy electron diffraction, scanning tunneling microscopy, and x-ray photoelectron spectroscopy study  

Science Conference Proceedings (OSTI)

The growth of epitaxial ultrathin BaTiO{sub 3} films on a Pt(100) substrate has been studied by scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and x-ray photoelectron spectroscopy (XPS). The films have been prepared by radio-frequency-assisted magnetron sputter deposition at room temperature and develop a long-range order upon annealing at 900 K in O{sub 2}. By adjusting the Ar and O{sub 2} partial pressures of the sputter gas, the stoichiometry was tuned to match that of a BaTiO{sub 3}(100) single crystal as determined by XPS. STM reveals the growth of continuous BaTiO{sub 3} films with unit cell high islands on top. With LEED already for monolayer thicknesses, the formation of a BaTiO{sub 3}(100)-(1 x 1) structure has been observed. Films of 2-3 unit cell thickness show a brilliant (1 x 1) LEED pattern for which an extended set of LEED I-V data has been acquired. At temperatures above 1050 K the BaTiO{sub 3} thin film starts to decay by formation of vacancy islands. In addition (4 x 4) and (3 x 3) surface reconstructions develop upon prolonged heating.

Foerster, Stefan; Huth, Michael; Schindler, Karl-Michael; Widdra, Wolf [Institute of Physics, Martin-Luther-Universitaet Halle-Wittenberg, Halle (Germany)

2011-09-14T23:59:59.000Z

165

Excitonic enhancement of nonradiative energy transfer from a quantum well in the optical near field of energy gradient quantum dots  

E-Print Network (OSTI)

Excitonic enhancement of nonradiative energy transfer from a quantum well in the optical near field of energy gradient quantum dots Sedat Nizamoglu, Pedro Ludwig Hernández-Martínez, Evren Mutlugun, Durmus misfit strains on the band offsets of Zn1-xBexO/ZnO quantum wells: A first-principles analysis J. Appl

Demir, Hilmi Volkan

166

Combining Discrete Dislocation Dynamics with Scanning ...  

Science Conference Proceedings (OSTI)

Abstract Scope, Scanning transmission electron microscopy (STEM) is a powerful ... Deformation and Annealing in Zr-2.5Nb by Diffraction Line Profile Analysis.

167

Multifocal Multiphoton Laser-Scanning Structured Illumination ...  

Multifocal Multiphoton Laser-Scanning Structured Illumination Microscopy with Whole-Field Detection Colorado School of Mines. Contact CSM About This Technology

168

Microscopy Methods  

Science Conference Proceedings (OSTI)

... NIST has worked extensively with microscope manufacturers such as FEI ... Electron microscopy methods have been used to characterize potential ...

2012-10-05T23:59:59.000Z

169

Real-time scanning tunneling microscopy observations of the oxidation of a Ti/Pt(111)-(2x2) surface alloy using O{sub 2} and NO{sub 2}  

SciTech Connect

The authors have used scanning tunneling microscopy (STM), low energy electron diffraction (LEED), and Auger electron spectroscopy (AES) to study the nascent oxidation of an ordered Ti/Pt(111)-(2x2) surface alloy exposed to oxygen (O{sub 2}) or nitrogen dioxide (NO{sub 2}) under ultrahigh vacuum conditions. The Ti/Pt(111)-(2x2) surface alloy was formed by depositing an ultrathin Ti film on Pt(111) and annealing to 1050 K. This produces an alloy film in which the surface layer is pure Pt and the second layer contains Ti atoms in a (2x2) structure, which causes the pattern observed by STM and LEED. Real-time imaging of the surface at 300 K was carried out by continuously scanning with the STM while either O{sub 2} or NO{sub 2} was introduced into the chamber. O{sub 2} exposures did not cause any gross structural changes; however oxygen was detected on the surface afterward using AES. Annealing this surface to 950 K resulted in the formation of an ordered TiO{sub x} overlayer as characterized by both LEED and STM. In contrast, NO{sub 2} exposures caused definite changes in the surface morphology at 300 K, and the root-mean-square roughness increased from 3.5 to 7.1 A after a large NO{sub 2} exposure. No ordered structures were produced by this treatment, but annealing the surface to 950 K formed an ordered pattern in LEED and corresponding clear, well-resolved structures in STM images. We account for these observations on the disruption or reconstruction of the Ti/Pt(111)-(2x2) surface alloy by arguments recalling that Ti oxidation is an activated process. The energetic barrier to TiO{sub x} formation cannot be surmounted at room temperature at low oxygen coverages, and annealing the surface was necessary to initiate this reaction. However, the higher oxygen coverages obtained using the more reactive oxidant NO{sub 2} lowered the chemical potential in the system sufficiently to overcome the activation barrier to extract Ti from the alloy at room temperature and form a disordered TiO{sub x} film. These results illustrate the importance of the surface oxygen coverage in nucleating the room temperature oxidation of the Pt-Ti surface alloys and further show the ability of NO{sub 2} in ultrahigh vacuum studies for probing the chemistry that will occur at higher O{sub 2} pressure.

Hsieh Shuchen; Liu, G. F.; Koel, Bruce E. [Center for Nanoscience and Nanotechnology, Department of Chemistry, National Sun Yat-Sen University, Kaohsiung, Taiwan (China); Department of Chemistry, Lehigh University, Bethlehem, Pennsylvania 18015-3172 (United States)

2008-09-15T23:59:59.000Z

170

Near-Field Nanopatterning and Associated Energy Transport Analysis with Thermoreflectance  

E-Print Network (OSTI)

Laser nano-patterning with near-field optical microscope (NSOM) and the associated energy transport analysis are achieved in this study. Based on combined experimental/theoretical analyses, it is found that laser nano-patterning with a NSOM probes strongly depend on the laser conditions and material properties of the target: the energy transport from the NSOM probes to the targets changes from pure optical to a combination of thermal and optical transport when the pulse duration of laser is increased from femtosecond to nanosecond. As a result, the mechanisms of nano-pattern formation on targets changes from nano-ablation to nano-oxidation/ recrystallization when the laser pulse duration is increased from femtosecond to nanosecond. Also, with the laser nano-patterning experiments, thermal damage of NSOM probes is observed which can be attributed to the low transport efficiency (10-4 – 10-6) and associated heating of the metal cladding of NSOM probes. The heating of NSOM probes are studied with developed time harmonic and transient thermoreflectance (TR) imaging. From time harmonic TR when the NSOM probes are driven with continuous laser, it is found that the location of heating of NSOM probes is ~20-30µm away from the NSOM tip. The strength of the heating is determined by the laser power (linear dependence), wavelength of the laser (stronger with short A), and aperture size of NSOM probes (stronger when aperture size < A/2). From the transient TR imaging when the NSOM probes are driven with pulsed laser, it is found that the peak temperature of the NSOM probe shifts much closer to the tip. The possible reason for the change in the location of peak temperature when continuous laser is changed to pulsed laser can be attributed to the competition between the heat generation and dissipation rates at different location of the probe: the tip experiences highest temperature with pulsed heating as the entire heating processes is adiabatic. The tip also experiences highest heat dissipation rate due to its large surface-to-volume ratio which overcomes the heat generation at the tip under quasi-steady state resulting in shift of the hot spot. The knowledge obtained in this study can be important in the future design of more efficient NSOM probes and other nano-optic devices.

Soni, Alok

2013-08-01T23:59:59.000Z

171

Regarding the Comments on "Near-field interference for the unidirectional excitation of electromagnetic guided modes" by Lee et al. [arXiv:1306.5068  

E-Print Network (OSTI)

Regarding the Comments on "Near-field interference for the unidirectional excitation of electromagnetic guided modes" by Lee et al. [arXiv:1306.5068 (2013)].

Rodríguez-Fortuńo, Francisco J; Ginzburg, Pavel; O'Connor, Daniel; Martínez, Alejandro; Wurtz, Gregory A; Zayats, Anatoly V

2013-01-01T23:59:59.000Z

172

The Feasibility of Near-field ODR Beam-size Monitoring at 23 GeV at FACET  

SciTech Connect

Extension of near-field optical diffraction radiation (ODR) imaging to the 23 GeV beams at the proposed FACET facility at SLAC has been evaluated. The beam-size sensitivity at the 10- to 20-{micro}m sigma level based on a simple model will be reported. Polarization effects are also seen to be important and will be discussed. The comparisons to previous experimental results and the modeling results indicate sufficient feasibility for planning of the experiments in the coming year.

Lumpkin, A.H.; /Fermilab; Yao, C.-Y.; /Argonne; Hogan, M.; /SLAC; Muggli, P.; /Southern California U.

2012-06-01T23:59:59.000Z

173

Near-field characterization of hydrogen and helium operation on the TFTR (Tokamak Fusion Test Reactor) diagnostic neutral beam  

DOE Green Energy (OSTI)

An Optical Multichannel Analyzer has been used to measure beam divergence and composition. This measurement is usually performed near the center of the neutralizer or beyond the magnet. In the past, these locations suffered difficult beam composition analysis and low light intensity, respectively. It has been determined that the light emission is relatively independent of neutralizer line density in the near field, allowing near-field measurements to overcome both difficulties. At optimum perveance, but under conditions of high gas throughput, the helium 1/e-divergence angle was measured to be 1.5{degree}. Further investigation found that the divergence decreased with gas throughput down to 1.25{degree}. Mimimum divergences for the full-, half-, and third-energy hydrogen components were 1.1{degree}, 1.2{degree}, and 1.4{degree}, respectively. Relative neutral hydrogen particle fluxes available for injection into TFTR are a function of perveance. At maximum perveance, the full-, half-, and third-energy atom fractions were 0.25 {plus minus} 0.04, 0.5 {plus minus} 0.04, and 0.25 {plus minus} 0.05, respectively. 10 refs., 5 figs.

Kamperschroer, J.H.; Schilling, G.; Roquemore, A.L.

1990-07-01T23:59:59.000Z

174

Benchmark Modeling of the Near-Field and Far-Field Wave Effects of Wave Energy Arrays  

SciTech Connect

This project is an industry-led partnership between Columbia Power Technologies and Oregon State University that will perform benchmark laboratory experiments and numerical modeling of the near-field and far-field impacts of wave scattering from an array of wave energy devices. These benchmark experimental observations will help to fill a gaping hole in our present knowledge of the near-field effects of multiple, floating wave energy converters and are a critical requirement for estimating the potential far-field environmental effects of wave energy arrays. The experiments will be performed at the Hinsdale Wave Research Laboratory (Oregon State University) and will utilize an array of newly developed BuoysĂ?Â?Ă?Â?Ă?Â?Ă?Âť that are realistic, lab-scale floating power converters. The array of Buoys will be subjected to realistic, directional wave forcing (1:33 scale) that will approximate the expected conditions (waves and water depths) to be found off the Central Oregon Coast. Experimental observations will include comprehensive in-situ wave and current measurements as well as a suite of novel optical measurements. These new optical capabilities will include imaging of the 3D wave scattering using a binocular stereo camera system, as well as 3D device motion tracking using a newly acquired LED system. These observing systems will capture the 3D motion history of individual Buoys as well as resolve the 3D scattered wave field; thus resolving the constructive and destructive wave interference patterns produced by the array at high resolution. These data combined with the device motion tracking will provide necessary information for array design in order to balance array performance with the mitigation of far-field impacts. As a benchmark data set, these data will be an important resource for testing of models for wave/buoy interactions, buoy performance, and far-field effects on wave and current patterns due to the presence of arrays. Under the proposed project we will initiate high-resolution (fine scale, very near-field) fluid/structure interaction simulations of buoy motions, as well as array-scale, phase-resolving wave scattering simulations. These modeling efforts will utilize state-of-the-art research quality models, which have not yet been brought to bear on this complex problem of large array wave/structure interaction problem.

Rhinefrank, Kenneth E.; Haller, Merrick C.; Ozkan-Haller, H. Tuba

2013-01-26T23:59:59.000Z

175

Positron microscopy  

Science Conference Proceedings (OSTI)

The negative work function property that some materials have for positrons make possible the development of positron reemission microscopy (PRM). Because of the low energies with which the positrons are emitted, some unique applications, such as the imaging of defects, can be made. The history of the concept of PRM, and its present state of development will be reviewed. The potential of positron microprobe techniques will be discussed also.

Hulett, L.D. Jr.; Xu, J.

1995-02-01T23:59:59.000Z

176

Simulating scanning tunneling microscope measurements  

E-Print Network (OSTI)

One of the largest problems in scanning tunneling microscopy design is noise control. It is the burden of the designer to determine if money should be used to build a floating room for vibration isolation or for top-of-the-line ...

Venkatachalam, Vivek

2006-01-01T23:59:59.000Z

177

Iran Thomas Auditorium, 8600 Transport Measurements by Scanning...  

NLE Websites -- All DOE Office Websites (Extended Search)

8600 Transport Measurements by Scanning Probe Microscopy: Possibilities for Graphene Randall M. Feenstra Department of Physics Carnegie Mellon University CNMS D D I I S S...

178

Near-field heat transfer at the spent fuel test-climax: a comparison of measurements and calculations  

Science Conference Proceedings (OSTI)

The Spent Fuel Test in the Climax granitic stock at the DOE Nevada Test Site is a test of the feasibility of storage and retrieval of spent nuclear reactor fuel in a deep geologic environment. Eleven spent fuel elements, together with six thermally identical electrical resistance heaters and 20 peripheral guard heaters, are emplaced 420 m below surface in a three-drift test array. This array was designed to simulate the near-field effects of thousands of canisters of nuclear waste and to evaluate the effects of heat alone, and heat plus ionizing radiation on the rock. Thermal calculations and measurements are conducted to determine thermal transport from the spent fuel and electrical resistance heaters. Calculations associated with the as-built Spent Fuel Test geometry and thermal source histories are presented and compared with thermocouple measurements made throughout the test array. Comparisons in space begin at the spent fuel canister and include the first few metres outside the test array. Comparisons in time begin at emplacement and progress through the first year of thermal loading in this multi-year test.

Patrick, W.C.; Montan, D.N.; Ballou, L.B.

1981-08-21T23:59:59.000Z

179

Salton Sea Geothermal Field, California, as a near-field natural analog of a radioactive waste repository in salt  

DOE Green Energy (OSTI)

Since high concentrations of radionuclides and high temperatures are not normally encountered in salt domes or beds, finding an exact geologic analog of expected near-field conditions in a mined nuclear waste repository in salt will be difficult. The Salton Sea Geothermal Field, however, provides an opportunity to investigate the migration and retardation of naturally occurring U, Th, Ra, Cs, Sr and other elements in hot brines which have been moving through clay-rich sedimentary rocks for up to 100,000 years. The more than thirty deep wells drilled in this field to produce steam for electrical generation penetrate sedimentary rocks containing concentrated brines where temperatures reach 365/sup 0/C at only 2 km depth. The brines are primarily Na, K, Ca chlorides with up to 25% of total dissolved solids; they also contain high concentrations of metals such as Fe, Mn, Li, Zn, and Pb. This report describes the geology, geophysics and geochemistry of this system as a prelude to a study of the mobility of naturally occurring radionuclides and radionuclide analogs within it. The aim of this study is to provide data to assist in validating quantitative models of repository behavior and to use in designing and evaluating waste packages and engineered barriers. 128 references, 33 figures, 13 tables.

Elders, W.A.; Cohen, L.H.

1983-11-01T23:59:59.000Z

180

Electron Microscopy | Center for Functional Nanomaterials  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Facility Electron Microscopy Facility Electron Microscopy This facility consists of four top-of-the line transmission electron microscopes, two of which are highly specialized instruments capable of extreme levels of resolution, achieved through spherical aberration correction. The facility is also equipped with extensive sample-preparation capabilities. The scientific interests of the staff focus on understanding the microscopic origin of the physical and chemical behavior of materials, with specific emphasis on in-situ studies of materials in native, functional environments. Capabilities Atomic-resolution imaging of internal materials structure with scanning transmission and transmission electron microscopy Spectroscopic characterization with energy dispersive x-ray

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


181

NEAR FIELD MODELING OF SPE1 EXPERIMENT AND PREDICTION OF THE SECOND SOURCE PHYSICS EXPERIMENTS (SPE2)  

SciTech Connect

Motion along joints and fractures in the rock has been proposed as one of the sources of near-source shear wave generation, and demonstrating the validity of this hypothesis is a focal scientific objective of the source physics experimental campaign in the Climax Stock granitic outcrop. A modeling effort has been undertaken by LLNL to complement the experimental campaign, and over the long term provide a validated computation capability for the nuclear explosion monitoring community. The approach involves performing the near-field nonlinear modeling with hydrodynamic codes (e.g., GEODYN, GEODYN-L), and the far-field seismic propagation with an elastic wave propagation code (e.g., WPP). the codes will be coupled together to provide a comprehensive source-to-sensor modeling capability. The technical approach involves pre-test predictions of each of the SPE experiments using their state of the art modeling capabilities, followed by code improvements to alleviate deficiencies identified in the pre-test predictions. This spiral development cycle wherein simulations are used to guide experimental design and the data from the experiment used to improve the models is the most effective approach to enable a transition from the descriptive phenomenological models in current use to the predictive, hybrid physics models needed for a science-based modeling capability for nuclear explosion monitoring. The objective of this report is to describe initial results of non-linear motion predictions of the first two SPE shots in the Climax Stock: a 220-lb shot at a depth of 180 ft (SPE No.1), and a 2570-lb shot at a depth of 150 ft (SPE No.2). The simulations were performed using the LLNL ensemble granite model, a model developed to match velocity and displacement attenuation from HARDHAT, PILE DRIVER, and SHOAL, as well as Russian and French nuclear test data in granitic rocks. This model represents the state of the art modeling capabilities as they existed when the SPE campaign was launched in 2010, and the simulation results presented here will establish a baseline that will be used for gauging progress as planned modeling improvements are implemented during the remainder of the SPE program. The initial simulations were performed under 2D axisymmetric conditions assuming the geologic medium to be a homogeneous half space. However, logging data obtained from the emplacement hole reveal two major faults that intersect the borehole at two different depth intervals (NSTec report, 2011) and four major joint sets. To evaluate the effect of these discrete structures on the wave forms generated they have performed 2D and 3D analysis with a Lagrangian hydrocode, GEODYN-L that shares the same material models with GEODYN but can explicitly take joints and fault into consideration. They discuss results obtained using these two different approaches in this report.

Antoun, T; Xu, H; Vorobiev, O; Lomov, I

2011-10-20T23:59:59.000Z

182

Short Course Agricultural Microscopy  

Science Conference Proceedings (OSTI)

Short Course in Agricultural Microscopy. Fargo North Dakota held June 13-16 2011. Sponsored by the Agricultural Microscopy Division of AOCS and the Great Plains Institute of Food Safety. Short Course Agricultural Microscopy Short Courses ...

183

Analysis and Design of a Test Apparatus for Resolving Near-Field Effects Associated With Using a Coarse Sun Sensor as Part of a 6-DOF Solution  

E-Print Network (OSTI)

Though the Aerospace industry is moving towards small satellites and smaller sensor technologies, sensors used for close-proximity operations are generally cost (and often size and power) prohibitive for University-class satellites. Given the need for low-cost, low-mass solutions for close-proximity relative navigation sensors, this research analyzed the expected errors due to near-field effects using a coarse sun sensor as part of a 6-degree-of-freedom (6-dof) solution. To characterize these near-field effects, a test bed (Characterization Test Apparatus or CTA) was proposed, its design presented, and the design stage uncertainty analysis of the CTA performed. A candidate coarse sun sensor (NorthStarTM) was chosen for testing, and a mathematical model of the sensor’s functionality was derived. Using a Gaussian Least Squares Differential Correction (GLSDC) algorithm, the model parameters were estimated and a comparison between simulated NorthStarTM measurements and model estimates was performed. Results indicate the CTA is capable of resolving the near-field errors. Additionally, this research found no apparent show stoppers for using coarse sun sensors for 6-dof solutions.

Stancliffe, Devin Aldin

2010-08-01T23:59:59.000Z

184

Agricultural Microscopy Division Of Interest  

Science Conference Proceedings (OSTI)

Agricultural Microscopy, Reports, Journals, Websites Agricultural Microscopy Division Of Interest Agricultural Microscopy agri-food sector agricultural Agricultural Microscopy analytical aocs articles biotechnology courses detergents division divisions f

185

A PRACTICAL GUIDE TO SCANNING PROBE MICROSCOPY Authors (first edition)  

E-Print Network (OSTI)

. This indicates that the PZN-5.5PT sample did not become depoled when lowering the applied electric field to 0

Ortiz, Christine

186

Advanced Photon Source | Combining Scanning Probe Microscopy and  

NLE Websites -- All DOE Office Websites (Extended Search)

0.21.2013 0.21.2013 Scientists study old photos for new solutions to corrosion Each week, Viewpoints features interviews with guests that have expertise and real-word experience regarding specific issues. The program is aired on over 450 radio stations throughout the country. This weeks featured guests are Volker Rose, Physicist with the Advanced Photon Source and Center for Nanoscale Materials, Argonne National Laboratory, (www.anl.gov). and Edward Vicenzi, Research scientist at the Smithsonian Institution's Museum Conservation Institute, (www.si.edu/mci). Material failure caused by corrosion is dangerous and costs billions of dollars every year. What if you could figure out how to prevent and treat corrosion at the tiniest "nano" level before it has a chance to cause a

187

Hydrogen adsorption on Ru(001) studied by Scanning Tunneling Microscopy  

E-Print Network (OSTI)

R.B. Anderson, The Fisher-Tropsch and Related Syntheses,for example in Fisher-Tropsch and Ammonia Synthesis

Tatarkhanov, Mous; Rose, Franck; Fomin, Evgeny; Ogletree, D. Frank; Salmeron, Miquel

2008-01-01T23:59:59.000Z

188

Band Excitation Method Applicable to Scanning Probe Microscopy ...  

Vehicles and Fuels; Wind Energy; Partners (27) Visual Patent Search; Success Stories; ... It is relevant to all SPM manufacturers and can yield data about a sample ...

189

Nonlinear Laser Scanning Microscopy of Pathological Vocal Fold ...  

Science Conference Proceedings (OSTI)

Pilot work from banked tissue biopsies from patients will be presented. ... Photoemission Study of Zircaloy-4 Oxides Structure via Synchrotron Radiation.

190

Rapid Functional Recognition Imaging in Scanning Probe Microscopy  

... Principal component maps of the spectrum image and (d) average signal. Summary: Technology Description

191

Band excitation method applicable to scanning probe microscopy ...  

Solar Photovoltaic; Solar Thermal; Startup America; ... signal having finite and predefined amplitude and phase spectrum in at least a first ...

192

Using Scanning Acoustic Microscopy to Study Subsurface Defects ...  

Science Conference Proceedings (OSTI)

The resolution of the reflection acoustic microscope is somewhat better than the resolution based on the Rayleigh criterion and is given by the equation6: ...

193

Analytical scanning evanescent microwave microscope and control stage  

DOE Patents (OSTI)

A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

2013-01-22T23:59:59.000Z

194

Analytical scanning evanescent microwave microscope and control stage  

DOE Patents (OSTI)

A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

Xiang, Xiao-Dong (Danville, CA); Gao, Chen (Anhui, CN); Duewer, Fred (Albany, CA); Yang, Hai Tao (Albany, CA); Lu, Yalin (Chelmsford, MA)

2009-06-23T23:59:59.000Z

195

NIST: Ultraviolet Photoemission Electron Microscopy  

Science Conference Proceedings (OSTI)

Ultraviolet Photoemission Electron Microscopy. Summary: Ultraviolet photoemission electron microscopy is used to study ...

2012-11-19T23:59:59.000Z

196

Agricultural Microscopy Division  

Science Conference Proceedings (OSTI)

The Agricultural Microscopy Division advances visual imaging in discerning the quality and content of ingredients and finished products of the feed, fertilizer, seed, and agri-food sectors. Agricultural Microscopy Division Divisions achievement ag

197

Expected near-field thermal environments in a sequentially loaded spent-fuel or high-level waste repository in salt  

SciTech Connect

This report describes the effect of realistic waste emplacement schedules on repository thermal environments. Virtually all estimates to date have been based on instantaneous loading of wastes having uniform properties throughout the repository. However, more realistic scenarios involving sequential emplacement of wastes reflect the gradual filling of the repository over its lifetime. These cases provide temperatures that can be less extreme than with the simple approximation. At isolated locations in the repository, the temperatures approach the instantaneous-loading limit. However, for most of the repository, temperature rises in the near-field are 10 to 40 years behind the conservative estimates depending on the waste type and the location in the repository. Results are presented for both spent-fuel and high-level reprocessing waste repositories in salt, for a regional repository concept, and for a single national repository concept. The national repository is filled sooner and therefore more closely approximates the instantaneously loaded repository. However, temperatures in the near-field are still 20/sup 0/C or more below the values in the simple model for 40 years after startup of repository emplacement operations. The results suggest that current repository design concepts based on the instantaneous-loading predictions are very conservative. Therefore, experiments to monitor temperatures in a test and evaluation facility, for example, will need to take into account the reduced temperatures in order to provide data used in predicting repository performance.

Rickertsen, L.D.; Arbital, J.G.; Claiborne, H.C.

1982-01-01T23:59:59.000Z

198

Spectroscopy and atomic force microscopy of biomass  

NLE Websites -- All DOE Office Websites (Extended Search)

Spectroscopy Spectroscopy and atomic force microscopy of biomass L. Tetard a,b , A. Passian a,b,n , R.H. Farahi a , U.C. Kalluri c , B.H. Davison c , T. Thundat a,b a Biosciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA b Department of Physics, University of Tennessee, Knoxville, TN 37996, USA c Environmental Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA a r t i c l e i n f o Keywords: Atomic force microscopy Spectroscopy Plant cells Biomass Nanomechanics a b s t r a c t Scanning probe microscopy has emerged as a powerful approach to a broader understanding of the molecular architecture of cell walls, which may shed light on the challenge of efficient cellulosic ethanol production. We have obtained preliminary images of both Populus and switchgrass samples using atomic force microscopy (AFM). The results show distinctive features that are shared by switchgrass

199

Center for Nanophase Materials Sciences (CNMS) - Publications  

NLE Websites -- All DOE Office Websites (Extended Search)

X. J. Zhang, "Near-Field Scanning Optical Microscopy with Monolithic Silicon Light Emitting Diode on Probe Tip," Appl. Phys. Lett. 92, 131106, (2008). Hoshino, K., L. Rozanski,...

200

Reply to "Comment on 'Accurate and fast numerical solution of Poisson's equation for arbitrary, space-filling Voronoi polyhedra: Near-field corrections revisited'"  

SciTech Connect

This is a Reply to the Comment by Gonis and Zhang1 on our recent paper.2 They discuss supposed issues with our “accurate and fast numerical solution of Poisson’s equation for arbitrary Voronoi polyhedra” (VP). The method of Gonis et al.3 and Vitos and Koll´ar4 correctly addresses the mathematical issues related to the solution of Poisson’s equation [and near-field corrections (NFCs)] using a spherical harmonic basis (L’s). However, as discussed in Ref. 2, their method is not numerically efficient and suffers from severe convergence issues from the multiply nested (conditionally convergent) multipole expansions to address r problems. Hence, the abstract in Ref. 2 clearly states that we provide a method to address a “fast but accurate numerical solution of the Poisson equation” for site-centered methods.

Alam, Aftab; Wilson, Brian G.; Johnson, Duane D.

2012-09-20T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


201

A High shear stress segment along the San Andreas Fault: Inferences based on near-field stress direction and stress magnitude observations in the Carrizo Plain Area  

SciTech Connect

Nearly 200 new in-situ determinations of stress directions and stress magnitudes near the Carrizo plain segment of the San Andreas fault indicate a marked change in stress state occurring within 20 km of this principal transform plate boundary. A natural consequence of this stress transition is that if the observed near-field ``fault-oblique`` stress directions are representative of the fault stress state, the Mohr-Coulomb shear stresses resolved on San Andreas sub-parallel planes are substantially greater than previously inferred based on fault-normal compression. Although the directional stress data and near-hydrostatic pore pressures, which exist within 15 km of the fault, support a high shear stress environment near the fault, appealing to elevated pore pressures in the fault zone (Byerlee-Rice Model) merely enhances the likelihood of shear failure. These near-field stress observations raise important questions regarding what previous stress observations have actually been measuring. The ``fault-normal`` stress direction measured out to 70 km from the fault can be interpreted as representing a comparable depth average shear strength of the principal plate boundary. Stress measurements closer to the fault reflect a shallower depth-average representation of the fault zone shear strength. If this is true, only stress observations at fault distances comparable to the seismogenic depth will be representative of the fault zone shear strength. This is consistent with results from dislocation monitoring where there is pronounced shear stress accumulation out to 20 km of the fault as a result of aseismic slip within the lower crust loading the upper locked section. Beyond about 20 km, the shear stress resolved on San Andreas fault-parallel planes becomes negligible. 65 refs., 15 figs.

Castillo, D. A., [Department of Geology and Geophysics, University of Adelaide (Australia); Younker, L.W. [Lawrence Livermore National Lab., CA (United States)

1997-01-30T23:59:59.000Z

202

Metrology Electron Microscopy  

Science Conference Proceedings (OSTI)

Metrology Electron Microscopy. Technical Contact: Joseph (Joe) Fu. 301-975-3795. Figure 1. SRM 484f Sample and its Micrograph. ...

2011-10-28T23:59:59.000Z

203

BNL | CFN: Electron Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

and chemistry at the atomic scale is crucial to modern materials science and nanotechnology. Advanced electron microscopy can provide the fundamental knowledge that will...

204

Acoustic Microscopy Applications*  

Science Conference Proceedings (OSTI)

Figure: ...Fig. 17 A portion of the 160 mm 2 (0.25 in. 2 ) area of an alumina ceramic disk scanned by an acoustic microscope

205

Novel Microscopy Techniques  

Science Conference Proceedings (OSTI)

Oct 19, 2011 ... Atomic Imaging of Surface and Bulk with an Aberration Corrected Scanning Electron Microscope: Yimei Zhu1; 1Brookhaven National ...

206

Piloted jet flames of CH{sub 4}/H{sub 2}/air: Experiments on localized extinction in the near field at high Reynolds numbers  

SciTech Connect

Measurements of temperature and major species concentrations, based on the simultaneous line-imaged Raman/Rayleigh/CO-LIF technique, are reported for piloted jet flames of CH{sub 4}/H{sub 2} fuel with varying amounts of partial premixing with air (jet equivalence ratios of {phi}{sub j} = 3.2, 2.5, 2.1 corresponding to stoichiometric mixture fraction values of {xi}{sub st} = 0.35, 0.43, 0.50, respectively) and varying degrees of localized extinction. Each jet flame is operated at a fixed and relatively high exit Reynolds number (60,000 or 67,000), and the probability of localized extinction is increased in several steps by progressively decreasing the flow rate of the pilot flame. Dimensions of the piloted burner, originally developed at Sydney University, are the same as for previous studies. The present measurements complement previous results from piloted CH{sub 4}/air jet flames as targets for combustion model calculations by extending to higher Reynolds number, including more steps in the progression of each flame from a fully burning state to a flame with high probability of local extinction, and adding the degree of partial premixing as an experimental parameter. Local extinction in these flames occurs close to the nozzle near a downstream location of four times the jet exit diameter. Consequently, these data provide the additional modeling challenge of accurately representing the initial development of the reacting jet and the near-field mixing processes. (author)

Barlow, R.S. [Combustion Research Facility, Sandia National Laboratories, Livermore, CA 94551-0969 (United States); Ozarovsky, H.C.; Lindstedt, R.P. [Department of Mechanical Engineering, Imperial College London, Exhibition Road, London SW7-2AZ (United Kingdom); Karpetis, A.N. [Department of Aerospace Engineering, Texas A and M University, College Station, TX 778453-3141 (United States)

2009-11-15T23:59:59.000Z

207

Transmission Electron Microscopy (TEM)  

Science Conference Proceedings (OSTI)

...Transmission electron microcopy (TEM) has been used since the 1950s to obtain very high resolution images of microstructures. As TEMs were enhanced to include features such as digitally scanned point beams and energy dispersive x-ray detectors

208

A case study on the influence of THM coupling on the near field safety of a spent fuel repository in sparsely fractured granite  

Science Conference Proceedings (OSTI)

In order to demonstrate the feasibility of geological disposal of spent CANDU fuel in Canada, a safety assessment was performed for a hypothetical repository in the Canadian Shield. The assessment shows that such repository would meet international criteria for dose rate; however, uncertainties in the assumed evolution of the repository were identified. Such uncertainties could be resolved by the consideration of coupled Thermal-Hydro-Mechanical-Chemical (THMC) processes. In Task A of the DECOVALEX-THMC project, THM models were developed within the framework of the theory of poroelasticity. Such model development was performed in an iterative manner, using experimental data from laboratory and field tests. The models were used to perform near-field simulations of the evolution of the repository in order to address the above uncertainties. This paper presents the definition and rationale of task A and the results of the simulations. From a repository safety point of view, the simulations predict that the maximum temperature would be well below the design target of 100 C, however the load on the container can marginally exceed the design value of 15 MPa. However, the most important finding from the simulations is that a rock damage zone could form around the emplacement borehole. Such damage zone can extend a few metres from the walls of the emplacement holes, with permeability values that are orders of magnitude higher than the initial values. The damage zone has the potential to increase the radionuclide transport flux from the geosphere; the effect of such an increase should be taken into account in the safety assessment and mitigated if necessary by the provision of sealing systems.

Nguyen, T.S.; Borgesson, L.; Chijimatsu, M.; Hernelind, J.; Jing, L.; Kobayashi, A.; Rutqvist, J.

2009-03-01T23:59:59.000Z

209

Nonlinear vibrational microscopy  

SciTech Connect

The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. Microscopic imaging with a vibrational spectroscopic contrast is achieved by generating signals in a nonlinear optical process and spatially resolved detection of the signals. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a. directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b. collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c. removing the residual beam; and d. detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution then IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers. CARS and SFG microscopy does not rely on the presence of fluorophores, but retains the resolution and three-dimensional sectioning capability of confocal and two-photon fluorescence microscopy. Complementary to these techniques, CARS and SFG microscopy provides a contrast mechanism based on vibrational spectroscopy. This vibrational contrast mechanism, combined with an unprecedented high sensitivity at a tolerable laser power level, provides a new approach for microscopic investigations of chemical and biological samples.

Holtom, Gary R. (Richland, WA); Xie, Xiaoliang Sunney (Richland, WA); Zumbusch, Andreas (Munchen, DE)

2000-01-01T23:59:59.000Z

210

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

SAMM SAMM EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Sub-Ă…ngstrom Microscopy and Microanalysis Facility In order to meet the scientific challenges of the future, the EMC has built a new state-of-the-art laboratory space for advanced electron microscopy. The new building has been designed to provide next- generation science with an operating environment that cannot be attained by renovating existing facilities. The EMC staff learned as much as possible from similar efforts around the world, including the SuperSTEM building at Daresbury, the Triebenberg Special Laboratory, the AML at Oak Ridge National Laboratory, the new NIST building, and various facilities for nanoscience.

211

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Acknowledgment Acknowledgment EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Acknowledgment Please acknowledge your use of the EMC in your publications and presentations with the following acknowledgment statement: The electron microscopy was accomplished at the Electron Microscopy Center at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC.

212

Regular Scanning Tunneling Microscope Tips can be Intrinsically Chiral  

Science Conference Proceedings (OSTI)

We report our discovery that regular scanning tunneling microscope tips can themselves be chiral. This chirality leads to differences in electron tunneling efficiencies through left- and right-handed molecules, and, when using the tip to electrically excite molecular rotation, large differences in rotation rate were observed which correlated with molecular chirality. As scanning tunneling microscopy is a widely used technique, this result may have unforeseen consequences for the measurement of asymmetric surface phenomena in a variety of important fields.

Tierney, Heather L.; Murphy, Colin J.; Sykes, E. Charles H. [Department of Chemistry, Tufts University, Medford, Massachusetts 02155-5813 (United States)

2011-01-07T23:59:59.000Z

213

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites

Laboratory Laboratory Electron Microscopy Center Argonne Home > EMC > EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

214

Agricultural Microscopy Division List  

Science Conference Proceedings (OSTI)

Name AffiliationCity, State, CountryAgricultural Microscopy Division2013 Members72 Members as of October 1, 2013Ajbani, RutviInstitute of Chemical TechnologyMumbai, MH, IndiaAlonso, CarmenPuerto Rico Dept ofAgricultureDorado, Puerto RicoArmbrust, KevinLoui

215

Vector generator scan converter  

DOE Patents (OSTI)

High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O (input/output) channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardward for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold.

Moore, James M. (Livermore, CA); Leighton, James F. (Livermore, CA)

1990-01-01T23:59:59.000Z

216

Vector generator scan converter  

DOE Patents (OSTI)

High printing speeds for graphics data are achieved with a laser printer by transmitting compressed graphics data from a main processor over an I/O channel to a vector generator scan converter which reconstructs a full graphics image for input to the laser printer through a raster data input port. The vector generator scan converter includes a microprocessor with associated microcode memory containing a microcode instruction set, a working memory for storing compressed data, vector generator hardware for drawing a full graphic image from vector parameters calculated by the microprocessor, image buffer memory for storing the reconstructed graphics image and an output scanner for reading the graphics image data and inputting the data to the printer. The vector generator scan converter eliminates the bottleneck created by the I/O channel for transmitting graphics data from the main processor to the laser printer, and increases printer speed up to thirty fold. 7 figs.

Moore, J.M.; Leighton, J.F.

1988-02-05T23:59:59.000Z

217

Microbial Impacts to the Near-Field Environment Geochemistry (MING): A Model for Estimating Microbial Communities in Repository Drifts at Yucca Mountain  

DOE Green Energy (OSTI)

Geochemical and microbiological modeling was performed to evaluate the potential quantities and impact of microorganisms on the geochemistry of the area adjacent to and within nuclear waste packages in the proposed repository drifts at Yucca Mountain, Nevada. The microbial growth results from the introduction of water, ground support, and waste package materials into the deep unsaturated rock. The simulations, which spanned one million years, were accomplished using a newly developed computer code, Microbial Impacts to the Near-Field Environment Geochemistry (MING). MING uses environmental thresholds for limiting microbial growth to temperatures below 120 C and above relative humidities of 90 percent in repository drifts. Once these thresholds are met, MING expands upon a mass balance and thermodynamic approach proposed by McKinley and others (1997), by using kinetic rates to supply constituents from design materials and constituent fluxes including solubilized rock components into the drift, to perform two separate mass-balance calculations as a function of time. The first (nutrient limit) assesses the available nutrients (C, N, P and S) and calculates how many microorganisms can be produced based on a microorganism stoichiometry of C{sub 160}(H{sub 280}O{sub 80})N{sub 30}P{sub 2}S. The second (energy limit) calculates the energy available from optimally combined redox couples for the temperature, and pH at that time. This optimization maximizes those reactions that produce > 15kJ/mol (limit on useable energy) using an iterative linear optimization technique. The final available energy value is converted to microbial mass at a rate of 1 kg of biomass (dry weight) for every 64 MJ of energy. These two values (nutrient limit and energy limit) are then compared and the smaller value represents the number of microorganisms that can be produced over a specified time. MING can also be adapted to investigate other problems of interest as the model can be used in saturated and unsaturated environments and in laboratory situations to establish microbial growth limitations. Other projected uses include investigations of contaminated locations where monitored natural attenuation or engineered bioremediation could be employed.

D.M. Jolley; T.F. Ehrhorn; J. Horn

2002-03-19T23:59:59.000Z

218

Scanning computed confocal imager  

DOE Patents (OSTI)

There is provided a confocal imager comprising a light source emitting a light, with a light modulator in optical communication with the light source for varying the spatial and temporal pattern of the light. A beam splitter receives the scanned light and direct the scanned light onto a target and pass light reflected from the target to a video capturing device for receiving the reflected light and transferring a digital image of the reflected light to a computer for creating a virtual aperture and outputting the digital image. In a transmissive mode of operation the invention omits the beam splitter means and captures light passed through the target.

George, John S. (Los Alamos, NM)

2000-03-14T23:59:59.000Z

219

Spectroscopic imaging in electron microscopy  

Science Conference Proceedings (OSTI)

In the scanning transmission electron microscope, multiple signals can be simultaneously collected, including the transmitted and scattered electron signals (bright field and annular dark field or Z-contrast images), along with spectroscopic signals such as inelastically scattered electrons and emitted photons. In the last few years, the successful development of aberration correctors for the electron microscope has transformed the field of electron microscopy, opening up new possibilities for correlating structure to functionality. Aberration correction not only allows for enhanced structural resolution with incident probes into the sub-angstrom range, but can also provide greater probe currents to facilitate mapping of intrinsically weak spectroscopic signals at the nanoscale or even the atomic level. In this issue of MRS Bulletin, we illustrate the power of the new generation of electron microscopes with a combination of imaging and spectroscopy. We show the mapping of elemental distributions at atomic resolution and also the mapping of electronic and optical properties at unprecedented spatial resolution, with applications ranging from graphene to plasmonic nanostructures, and oxide interfaces to biology.

Pennycook, Stephen J [ORNL; Colliex, C. [Universite Paris Sud, Orsay, France

2012-01-01T23:59:59.000Z

220

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

An Office of Science User Facility An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


221

Electron Microscopy Lab  

NLE Websites -- All DOE Office Websites (Extended Search)

Facilities » Facilities » Electron Microscopy Lab Electron Microscopy Lab Focusing on the study of microstructures with electron and ion beam instruments, including crystallographic and chemical techniques. April 12, 2012 Transmission electron microscope Rob Dickerson examines a multiphase oxide scale using the FEI Titan 80-300 transmission electron microscope. Contact Rob Dickerson (505) 667-6337 Email Rod McCabe (505) 606-1649 Email Pat Dickerson (505) 665-3036 Email Tom Wynn (505) 665-6861 Email Dedicated to the characterization of materials through imaging, chemical, and crystallographic analyses of material microstructures in support of Basic Energy Science, Laboratory Directed Research and Development, DoD, DOE, Work for Others, nuclear energy, and weapons programs. Go to full website »

222

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Training Training EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers User Training Prior Training in Electron Microscopy: People who wish to operate TEMs must have at least one college-level course in TEM with a lab component or previous TEM experience. The college course can't be one in which TEM was just one of many topics. For researchers who lack academic training and/or practical experience in electron microscopy, we suggest the short courses in TEM at the Hooke College of Applied Sciences, and the hands-on TEM courses at Northwestern University or the University of Chicago or Northern Illinois University.

223

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Overview Overview The mission of the Electron Microscopy Center (EMC) is to: Conduct materials research using advanced microstructural characterization methods; Maintain unique resources and facilities for scientific research for the both the Argonne National Laboratory and national scientific community. Develop and expand the frontiers of microanalysis by fostering the evolution of synergistic state-of-the-art resources in instrumentation, techniques and scientific expertise; The staff members of the EMC carry out their own research as well as participate in collaborative programs with other scientists at Argonne National Laboratory as well as researchers, educators and students worldwide. The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff perform collaborative research with members of other Divisions at Argonne National Laboratory and with collaborators from universities and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

224

Only critical information was scanned  

Office of Legacy Management (LM)

Only critical information was scanned. Entire document is available upon request - Click here to email a...

225

Scanning micro-sclerometer  

DOE Patents (OSTI)

A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch.

Oliver, Warren C. (Knoxville, TN); Blau, Peter J. (Oak Ridge, TN)

1994-01-01T23:59:59.000Z

226

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Laboratory, MST-6 Electron Microscopy Laboratory, MST-6 MST-6 Home Home In the MSL FEI Tecnai F30 Analytical TEM/STEM JEOL 6300FXV High Resolution SEM JEOL 3000F High Resolution Transmission Electron Microscope Philips XL30 F Scanning Electron Microscope & Orientation Imaging System Phillips CM30 Transmission Electron Microscope In the Sigma Building JEOL 840 EPMA with Wavelength Dispersive Spectroscopy FEI Strata DB235 FIB/SEM FEI XL30 Environmental Scanning Electron Microscope & Orientation Imaging System CONTACTS Bob Field 665.3938 Pat Dickerson 665.3036 Rob Dickerson 667.6337 Rod McCabe 606.1649 The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory (EML) is part of MST-6, the Materials Technology - Metallurgy Group within the Materials Science and Technology Division at Los Alamos National Laboratory. It is a facility dedicated to the characterization of materials primarily through imaging, chemical, and crystallographic analyses of material microstructures with several electron and ion beam instruments. Accessory characterization techniques and equipment include energy dispersive x-ray analysis (EDS), wavelength dispersive x-ray analysis (WDS), electron backscatter diffraction (EBSD) and orientation imaging microscopy (OIM), and electron energy loss spectroscopy (EELS).

227

Agricultural Microscopy Newsletter March 11  

Science Conference Proceedings (OSTI)

AOCS Agricultural Microscopy Division Newsletter March 2011 Greetings from the Chairperson The Agricultural Microscopy Division would like to take this opportunity to express our sincere sympathy to the family and friends of George Liepa who rece

228

Advanced Developments in Electron Microscopy  

Science Conference Proceedings (OSTI)

About this Symposium. Meeting, Materials Science & Technology 2011. Symposium, Advanced Developments in Electron Microscopy. Sponsorship, MS&T ...

229

Argonne CNM: X-Ray Microscopy Capabilities  

NLE Websites -- All DOE Office Websites (Extended Search)

X-Ray Microscopy Facilities X-Ray Microscopy Facilities The Hard X-Ray Nanoprobe (HXN) facility provides scanning fluorescence, scanning diffraction, and full-field transmission and tomographic imaging capabilities with a spatial resolution of 30 nm over a spectral range of 6-12 keV. Modes of Operation Full-Field Transmission Imaging and Nanotomography X-ray transmission imaging uses both the absorption and phase shift of the X-ray beam by the sample as contrast mechanisms. Absorption contrast is used to map the sample density. Elemental constituents can be located by using differential edge contrast in this mode. Phase contrast can be highly sensitive to edges and interfaces even when the X-ray absorption is weak. These contrast mechanisms are exploited to image samples rapidly in full-field transmission mode under various environmental conditions, or combined with nanotomography methods to study the three-dimensional structure of complex and amorphous nanomaterials with the HXN.

230

An Algebra of Scans  

E-Print Network (OSTI)

A parallel prefix circuit takes n inputs x1 , x2 , . . . , xn and produces the n outputs x1 , x1 x2 , . . . , x1 x2 xn , where `#' is an arbitrary associative binary operation. Parallel prefix circuits and their counterparts in software, parallel prefix computations or scans, have numerous applications ranging from fast integer addition over parallel sorting to convex hull problems. A parallel prefix circuit can be implemented in a variety of ways taking into account constraints on size, depth, or fanout. Traditionally, implementations are either defined graphically or by enumerating the underlying graph. Both approaches have their pros and cons. A figure if well drawn conveys the possibly recursive structure of the scan but it is not amenable to formal manipulation. A description in form of a graph while rigorous obscures the structure of a scan and is equally hard to manipulate. In this paper we show that parallel prefix circuits enjoy a very pleasant algebra. Using only two basic building blocks and four combinators all standard designs can be described succinctly and rigorously. The rules of the algebra allow us to prove the circuits correct and to derive circuit designs in a systematic manner. lord darlington. . . . [Sees a fan lying on the table.] And what a wonderful fan! May I look at it? lady windermere. Do. Pretty, isn't it! It's got my name on it, and everything. I have only just seen it myself. It's my husband's birthday present to me. You know to-day is my birthday? --- Oscar Wilde, Lady Windermere's Fan 1

Ralf Hinze

2004-01-01T23:59:59.000Z

231

Free Motion Scanning System  

DOE Patents (OSTI)

The present invention relates to an ultrasonic scanner and method for the imaging of a part surface, the scanner comprising: a probe assembly spaced apart from the surface including at least two tracking signals for emitting electromagnetic radiation and a transmitter for emitting ultrasonic waves onto a surface in order to induce at least a portion of said waves to be reflected from the surface, at least one detector for receiving the electromagnetic radiation wherein the detector is positioned to receive said radiation from the tracking signals, an analyzing means for recognizing a three-dimensional location of the tracking signals based on said emitted electromagnetic radiation, a differential conversion means for generating an output signal representative of the waveform of the reflected waves, and a means for relating said tracking signal location with the output signal and projecting an image of the resulting data. The scanner and method are particularly useful to acquire ultrasonic inspection data by scanning the probe-over a complex part surface in an arbitrary scanning pattern.

Sword, Charles K.

1998-06-18T23:59:59.000Z

232

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Becoming a User Becoming a User EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Procedure to Become a User at the EMC 1. Summary All users have to fulfill certain requirements before access to the EMC can be granted. The following list provides short descriptions of the requirements. Details can be found on this page and via the relevant links at the left. Register for access to Argonne's scientific user facilities (or update your user registration information).

233

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Submit an EMC Proposal Submit an EMC Proposal EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Submit an EMC Proposal EMC Proposal Submission Deadline Dates for FY2014: November 1, 2013 March 7, 2014 July 11, 2014 Is your proposal a multi-facility proposal? In other words, do you intend to submit proposals to EMC and APS or CNM for your research project? If your answer is "yes," go now to the Proposal Gateway.

234

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

EMC Users Committee EMC Users Committee EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers EMC Users Committee An EMC Users Committee has been organized to enhance communication between the user community and the EMC. While the EMC relies on and encourages strong interaction among its users and between its staff and users, the Users Committee provides an additional formal mechanism for user input into EMC planning and operations to ensure that users' needs and concerns are addressed.

235

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

End-of-Proposal Report End-of-Proposal Report EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SĂ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers End-of-Proposal Report In accordance with the User Agreement, please provide the EMC with the following information when your proposal expires (one year after its acceptance date or when the experiments end, whichever is sooner). A research summary/progress report using these two templates:

236

Scanning Confocal Electron Microscope (SCEM)  

Transmission/Scanning Transmission Electron Microscope. The SCEM enables imaging of sub-surface structures of thick, optically opaque materials, ...

237

Timing-Driven Partial Scan  

Science Conference Proceedings (OSTI)

We present a partial scan approach, which aims at reducing both area overhead and performance degradation caused by test logic. Given a target speed and an initial design that meets the target, the algorithm selects a minimum set of scan flip-flops, ... Keywords: Test algorithms, partial scan, test synthesis, design for test

Jing-yang Jou; Kwang-ting (tim) Cheng

1995-12-01T23:59:59.000Z

238

Agricultural Microscopy Division Newsletter September 2013  

Science Conference Proceedings (OSTI)

Read the latest news from the Agricultural Microscopy division. Agricultural Microscopy Division Newsletter September 2013 Agricultural Microscopy Division Newsletter September 2013 ...

239

NCEM National Center for Electron Microscopy: Links  

NLE Websites -- All DOE Office Websites (Extended Search)

National Laboratory, Center for Materials Research Brookhaven National Laboratory, Electron Microscopy Program Sites of Interest to the Microscopy Community The Microscopy...

240

Study of Lignocellulosic Material Degradation with CARS Microscopy  

DOE Green Energy (OSTI)

The program of research undertaken by our Harvard group, in collaboration with Dr. Ding at the National Renewable Energy Laboratory (NREL) in Golden, CO, seeks to introduce, validate and apply a new analytical technique to study the conversion of lignocellulosic biomass into ethanol. This conversion process has been the subject of intense interest over the past few years because of its potential to provide a clean, renewable source of energy to meet increasing global demand. During the funding period, we have clearly demonstrated visualization of lignin and cellulose using intrinsic vibrational contrast with simulated Raman scattering (SRS) microscopy, developed at Harvard. Our approach offers high spatial resolution and time resolution that is sufficient to capture the kinetics of a pre?treatment process. This is reflected by the publications listed below, as well as the use of SRS microscopy at NREL as a routine analysis tool for research on lignocellulosic biomass. In our original proposal, we envisioned moving to near?field CARS imaging in order to perform chemical mapping at the nanoscale. However, given the dramatic progress made by our group in SRS imaging, we concentrated our efforts on using multi?component SRS (lignin, cellulose, lipid, water, protein, deuterated metabolites, etc.) to quantitatively understand the spatially dispersed kinetics in a variety of plant samples under a variety of conditions. In addition, we built a next generation laser system based on fiber laser technology that allowed rugged and portable instrumentation for SRS microscopy. We also pursued new imaging approaches to improve the acquisition speed of SRS imaging of lignocellulose without sacrificing signal?to?noise ratio. This allowed us to image larger volumes of tissue with higher time resolution to get a more comprehensive picture of the heterogeneity of this chemical process from the submicron up to the centimeter scale.

Xie, Xiaoliang Sunney; Ding, Shi-You

2013-09-30T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


241

Open-loop Band excitation Kelvin Probe Force Microscopy  

Science Conference Proceedings (OSTI)

A multidimensional scanning probe microscopy approach for quantitative, cross-talk free mapping of surface electrostatic properties is demonstrated. Open-loop band excitation Kelvin probe force microscopy (OL BE KPFM) probes the full response-frequency-potential surface at each pixel at standard imaging rates. The subsequent analysis reconstructs work function, tip surface capacitance gradient and resonant frequency maps, obviating feedback-related artifacts. OL BE KPFM imaging is demonstrated for several materials systems with topographic, potential and combined contrast. This approach combines the features of both frequency and amplitude KPFM and allows complete decoupling of topographic and voltage contributions to the KPFM signal.

Guo, Senli [ORNL; Kalinin, Sergei V [ORNL; Jesse, Stephen [ORNL

2012-01-01T23:59:59.000Z

242

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

General Information for EMC Users General Information for EMC Users The Electron Microscopy Center (EMC) is an Office of Science User Facility operated for the U.S. Department of Energy Office of Science by Argonne National Laboratory. It is one of three scientific user facilities for electron beam microcharacterization and one of several National User Facilities located at Argonne National Laboratory. As a scientific user facility, the EMC supports user-accessible instruments (Resources) for high spatial resolution microanalysis, field imaging, nanoscale structural characterization, nanoscale fabrication and manipulation, and unique in situ studies of materials under the influence of ion-beam irradiation. These capabilities are used in a diverse variety of research areas to address grand challenge scientific questions encompassing, for example, energy-related studies, biology, astrophysics, archaeology, superconductivity, nanotechnology, environmental engineering, tribology, and ferroelectricity. The research is performed both by users and by EMC staff. While many users work independently, the most challenging research activities require extensive contributions from EMC staff.

243

Materials Applications of Photoelectron Emission Microscopy  

SciTech Connect

Photoelectron emission microscopy (PEEM) is a versatile technique that can image a variety of materials including metals, semiconductors and even insulators. Under favorable conditions the most advanced aberration corrected instruments have a spatial resolution approaching 2 nm. Although PEEM cannot compete with transmission or scanning electron microscopies for ultimate resolution, the technique is much more gentle and has the unique advantage of imaging structure as well as electronic and magnetic states on the nanoscale. Since the image contrast is derived from spatial variations in electron photoemission intensity, PEEM is ideal for interrogating both static and dynamic electronic properties of complex nanostructured materials. PEEM can be performed using a variety of photoexcitation sources including synchrotron emission, femtosecond laser pulses and conventional UV lamp emission. Each source has advantages, for example, fs laser excitation enables time-resolved imaging for study of ultrafast dynamics of surface intermediate states while tunable synchrotron sources allow chemically specific excitation. Even more detail can be extracted from energy resolved PEEM. Here, we review the key principles and contrast mechanisms of PEEM and briefly summarize materials applications of PEEM with examples of a thermally-induced structural phase transformation in barium titanate, inter-diffusion between thin metal copper and ruthenium layers, and multiphoton imaging of polystyrene nanoparticles on a silver coated substrate.

Xiong, Gang; Shao, Rui; Peppernick, Samuel J.; Joly, Alan G.; Beck, Kenneth M.; Hess, Wayne P.; Cai, Mingdong; Duchene, J.; Wang, J. Y.; Wei, Wei

2010-12-30T23:59:59.000Z

244

Feed Microscopy Laboratory Proficiency Testing Program  

Science Conference Proceedings (OSTI)

Lab Proficiency Testing service for Feed Microscopy using microscopic examination of animal feed samples and AAFCO terminology. Feed Microscopy Laboratory Proficiency Testing Program Agricultural Microscopy agri-food sector agricultural Agricultural Micr

245

Scanning/Transmission Electron Microscopes  

NLE Websites -- All DOE Office Websites (Extended Search)

ScanningTransmission Electron Microscopes Nion UltraSTEM 60-100 dedicated aberration-corrected STEM for low- to mid-voltage operation and Enfina EELS Contact: Juan-Carlos Idrobo,...

246

Transverse section radionuclide scanning system  

DOE Patents (OSTI)

This invention provides a transverse section radionuclide scanning system for high-sensitivity quantification of brain radioactivity in cross-section picture format in order to permit accurate assessment of regional brain function localized in three-dimensions. High sensitivity crucially depends on overcoming the heretofore known raster type scanning, which requires back and forth detector movement involving dead-time or partial enclosure of the scan field. Accordingly, this invention provides a detector array having no back and forth movement by interlaced detectors that enclose the scan field and rotate as an integral unit around one axis of rotation in a slip ring that continuously transmits the detector data by means of laser emitting diodes, with the advantages that increased amounts of data can be continuously collected, processed and displayed with increased sensitivity according to a suitable computer program.

Kuhl, David E. (Rosemont, PA); Edwards, Roy Q. (Plymouth Township, PA)

1976-01-01T23:59:59.000Z

247

Near-Field Magneto-Optical Microscope  

DOE Patents (OSTI)

A device and method for mapping magnetic fields of a sample at a resolution less than the wavelength of light without altering the magnetic field of the sample is disclosed. A device having a tapered end portion with a magneto-optically active particle positioned at the distal end thereof in communication with a fiber optic for transferring incoming linearly polarized light from a source thereof to the particle and for transferring reflected light from the particle is provided. The fiber optic has a reflective material trapping light within the fiber optic and in communication with a light detector for determining the polarization of light reflected from the particle as a function of the strength and direction of the magnetic field of the sample. Linearly polarized light from the source thereof transferred to the particle positioned proximate the sample is affected by the magnetic field of the sample sensed by the particle such that the difference in polarization of light entering and leaving the particle is due to the magnetic field of the sample. Relative movement between the particle and sample enables mapping.

Vlasko-Vlasov, Vitalii; Welp, Ulrich; and Crabtree, George W.

2005-12-06T23:59:59.000Z

248

Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips  

Science Conference Proceedings (OSTI)

A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM.

Eisenstein, Alon; Goh, M. Cynthia [Department of Chemistry and Institute for Optical Sciences, University of Toronto, 80 St. George Street, Toronto M5S 3H6 (Canada)

2012-03-15T23:59:59.000Z

249

Electron microscopy of ceramic superconductors  

SciTech Connect

The critical current Jc is at least as important as Tc (transition temperature) for applications in superconducting materials. Jc is strongly dependent on microstructure and, in consequence, electron microscopy will continue to be important in the development of practical ceramic superconductors. We will review the progress that has been made over the past year or so in studying the superconductors by electron microscopy techniques of all kinds--conventional, high resolution, analytical, etc. A thorough review is impossible but a bibliography is available, as well as two special issues of Journals. 25 refs., 9 figs.

Mitchell, T.E.; Roy, T.

1988-01-01T23:59:59.000Z

250

Electron Microscopy of Carbon Nanotube Composites  

Science Conference Proceedings (OSTI)

Electron Microscopy of Carbon Nanotube Composites. Summary: Carbon nanomaterials such as carbon nanotubes (CNTs ...

2013-07-01T23:59:59.000Z

251

Microscopy for STEM Educators - SPIE Conference 2012  

Science Conference Proceedings (OSTI)

SPIE Conference 2012. SPIE Conference 2012. ... Microscopy for STEM Educators - SPIE Conference 2012. Sound interesting? ...

2012-05-09T23:59:59.000Z

252

Analytical electron microscopy characterization of uranium-contaminated soils from the Fernald Site, FY1993 report  

SciTech Connect

A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM) is being used to determine the nature of uranium in soils from the Fernald Environmental Management Project. The information gained from these studies is being used to develop and test remediation technologies. Investigations using SEM have shown that uranium is contained within particles that are typically 1 to 100 {mu}m in diameter. Further analysis with AEM has shown that these uranium-rich regions are made up of discrete uranium-bearing phases. The distribution of these uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Cunnane, J.C.; Brown, N.R.; Dietz, N.L.

1994-10-01T23:59:59.000Z

253

A new high-resolution two-dimensional micropositioning device for scanning probe microscopy applications  

E-Print Network (OSTI)

in the depoling field in the BT layer as well as a drop in the internal field in the ST layer that induces

254

Structure and Reactions of Carbon and Hydrogen on Ru(0001): A Scanning Tunneling Microscopy Study  

E-Print Network (OSTI)

reactions, including Fischer-Tropsch synthesis, whereby coalcatalytic activity in Fischer-Tropsch synthesis, hydrocarbon

Shimizu, Tomoko K.

2009-01-01T23:59:59.000Z

255

HOGE DRUK SCANNING TUNNELING MICROSCOPIE VOOR KATALYTISCH ONDERZOEK: ONTWIKKELING EN PRESTATIES VAN DE "REACTOR-STM"  

E-Print Network (OSTI)

-y richting ongeveer 1 �/s. EERSTE METINGEN Als eerste modelsysteem hebben wij Fisher-Tropsch synthese op Co als industriële Fischer-Tropsch katalysator, met STM gasgeïnduceerde verruwing is waargenomen [1], en

Frenken, J.W.M.

256

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

et al. studied wood combustion and diesel combustionrange of deposited combustion products: creosote (wood smoke

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

257

Soft x-ray scanning transmission x-ray microscopy (STXM) of actinide particles  

E-Print Network (OSTI)

the Np(V,VI) solid. A plutonium elemental map was obtainedspectromicroscopy, plutonium, neptunium *Correspondingwell as for metallic plutonium. [19,20] A useful comparison

Nilsson, Hans J.; Tyliszczak, Tolek; Wilson, Richard E.; Werme, Lars; Shuh, David K.

2005-01-01T23:59:59.000Z

258

[Scanning tunnelling microscopy and spectroscopy of ceramic grain boundaries]. [Annual report, September 1992--September 1993  

SciTech Connect

Objective is to study the local geometric and electronic structure at grain boundaries in oxides; this was motivated by the potential to use STM and tunneling spectroscopy on semiconducting ceramics. In order to understand the imaging of low conductivity materials, a number of transition metal oxides were examined: ZnO, TiO{sub 2}. Spatial resolution limits are considered. Conductance profiles across silicon grain boundaries are compared with those across more complex SrTiO{sub 3} grain boundaries. Calculations of space charge in complex oxides are presented. A SEM/STM was constructed which operates in ultrahigh vacuum and has large scale positioning capability (> 1 cm).

Not Available

1993-10-01T23:59:59.000Z

259

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

Synchrotron Light Source, NSLS, (Brookhaven, USA) during thehave been at the ALS or NSLS. Several new instruments aremicroscopes at the ALS and NSLS are provided elsewhere. 18-

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

260

Nephila clavipes Spider Dragline Silk Microstructure Studied by Scanning Transmission X-ray Microscopy  

E-Print Network (OSTI)

). For a uniaxial system such as a fiber, the dichroic ratio image can then be used to calculate a map of the order structure or any periodicity along the fiber was observed at this spatial resolution. The surface of fresh by the spinning speed, STXM measurements clearly highlight microstructure differences. The slowpull fiber contains

Hitchcock, Adam P.

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


261

Scanning Transmission X-ray Microscopy: Applications in Atmospheric Aerosol Research  

E-Print Network (OSTI)

in secondary organic aerosol. Environ. Sci. Technol. 41 ,particles from an urban aerosol. Environ. Sci. Technol. 26 ,carbonaceous atmospheric aerosols. Journal of Aerosol

Moffet, Ryan C.

2011-01-01T23:59:59.000Z

262

Scan  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

NAME OF PERSON WITH WHOM TO CONFER TELEPHONE DATE ARCHIVIST OF THE UNITED STATES Sharon Evelin NUMBER 1 301 -903-3455 i 1 - I REQUEST FOR REe?RDS DISPOSITION AUTHORITY NUMBER /dl- Y s + - o + - / TO: NATIONAL ARCH~VES & RECORDS ADMINISTRATION 8601 ADELPHI ROAD COLLEGE PARK, MD 20740-6001 1. FROM (Agency or establ~shment) U.S. DEPARTMENT OF ENERGY MAJOR SUBDIVISION Office of the Chief Information Officer MINOR SUBDIVISION Records Management Division I 1 8. DESCRIPTION OF ITEM AND PROPOSED DISPOSITION 1 9. GRS OR 1 10. A ~ T I O r Date received I Z L U V - ~ NOTIFICATION TO AGENCY In accordance with the provlslons of 44 U.S.C 3303a, the dlsposltlon request, Including amendments, 1 s approved except for Items that may be marked "dlsposltion not approved" or "withdrawn" In column 10.

263

DECOVALEX-THMC Task D: Long-Term Permeability/Porosity Changes inthe EDZ and Near Field due to THM and THC Processes in Volcanic andCrystaline-Bentonite Systems, Status Report October 2005  

Science Conference Proceedings (OSTI)

The DECOVALEX project is an international cooperativeproject initiated by SKI, the Swedish Nuclear Power Inspectorate, withparticipation of about 10 international organizations. The name DECOVALEXstands for DEvelopment of COupled models and their VALidation againstExperiments. The general goal of this project is to encouragemultidisciplinary interactive and cooperative research on modelingcoupled processes in geologic formations in support of the performanceassessment for underground storage of radioactive waste. Three multi-yearproject stages of DECOVALEX have been completed in the past decade,mainly focusing on coupled thermal-hydrological-mechanicalprocesses.Currently, a fourth three-year project stage of DECOVALEX isunder way, referred to as DECOVALEX-THMC. THMC stands for Thermal,Hydrological, Mechanical, and Chemical processes. The new project stageaims at expanding the traditional geomechanical scope of the previousDECOVALEX project stages by incorporating geochemical processes importantfor repository performance. The U.S. Department of Energy (DOE) leadsTask D of the new DECOVALEX phase, entitled "Long-termPermeability/Porosity Changes in the EDZ and Near Field due to THC andTHM Processes for Volcanic and Crystalline-Bentonite Systems." In itsleadership role for Task D, DOE coordinates and sets the direction forthe cooperative research activities of the international research teamsengaged in Task D.

Birkholzer, J.; Rutqvist, J.; Sonnenthal, E.; Barr, D.

2005-11-01T23:59:59.000Z

264

Scanning x-ray microscope  

Science Conference Proceedings (OSTI)

A scanning x-ray microscope is described including: an x-ray source capable of emitting a beam of x-rays; a collimator positioned to receive the beam of x-rays and to collimate this beam, a focusing cone means to focus the beam of x-rays, directed by the collimator, onto a focal plane, a specimen mount for supporting a specimen in the focal plane to receive the focused beam of x-rays, and x-ray beam scanning means to relatively move the specimen and the focusing cone means and collimator to scan the focused x-ray beam across the specimen. A detector is disposed adjacent the specimen to detect flourescent photons emitted by the specimen upon exposure to the focused beam of x-rays to provide an electrical output representative of this detection. Means are included for displaying and/or recording the information provided by the output from the detector, as are means for providing information to the recording and/or display means representative of the scan rate and position of the focused x-ray beam relative to the specimen whereby the recording and/or display means can correlate the information received to record and/or display quantitive and distributive information as to the quantity and distribution of elements detected in the specimen. Preferably there is provided an x-ray beam modulation means upstream, relative to the direction of emission of the xray beam, of the focusing cone means.

Wang, C.

1982-02-23T23:59:59.000Z

265

A millikelvin scanning tunneling microscope with two independent scanning systems  

E-Print Network (OSTI)

We describe the design, construction and operation of a scanning tunneling microscope (STM) with two tips that can independently acquire simultaneous scans of a sample. The STM is mounted on a dilution refrigerator and the setup includes vibration isolation, rf-filtered wiring, an ultra high vacuum (UHV) sample preparation chamber and sample transfer mechanism. We present images and spectroscopy taken with superconducting Nb tips with the refrigerator at 35 mK that indicate that the effective temperature of our tips/sample is approximately 184 mK, corresponding to an energy resolution of 16 $\\mu$eV. Atomic resolution topographic images of an Au(100) surface taken with the inner and outer tips were found to have root mean square roughness of 1.75 $\\pm$ 0.01 pm and 3.55 $\\pm$ 0.03 pm respectively.

Roychowdhury, A; Anderson, J R; Lobb, C J; Wellstood, F C; Dreyer, M

2013-01-01T23:59:59.000Z

266

Visual-servoing optical microscopy  

DOE Patents (OSTI)

The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

Callahan, Daniel E. (Martinez, CA); Parvin, Bahram (Mill Valley, CA)

2011-05-24T23:59:59.000Z

267

Visual-servoing optical microscopy  

DOE Patents (OSTI)

The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time: quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

Callahan, Daniel E. (Martinez, CA); Parvin, Bahram (Hercules, CA)

2009-06-09T23:59:59.000Z

268

High Resolution Transmission Microscopy Characterization of an ...  

Science Conference Proceedings (OSTI)

High Resolution Transmission Microscopy Characterization of an Oxide ... Line Dislocation Dynamics Simulation of fundamental dislocation properties in ...

269

Microscopy Technique Could Help Computer Industry ...  

Science Conference Proceedings (OSTI)

Microscopy Technique Could Help Computer Industry Develop 3-D Components. From NIST Tech Beat: June 25, 2013. ...

2013-06-25T23:59:59.000Z

270

Transmission Electron Microscopy Studies on Lithium Battery ...  

Science Conference Proceedings (OSTI)

About this Abstract. Meeting, 2012 TMS Annual Meeting & Exhibition. Symposium , Energy Nanomaterials. Presentation Title, Transmission Electron Microscopy ...

271

Cost-free scan: a low-overhead scan path design methodology  

Science Conference Proceedings (OSTI)

Conventional scan design imposes considerable area and delay overhead by using larger scan flip-flops and additional scan wires without utilizing the functionality of the combinational logic. We propose a novel low-overhead scan design methodology, called ... Keywords: Scan design, DFT, Testing

Chih-Chang Lin; Mike Tien-Chien Lee; Malgorzata Marek-Sadowska; Kuang-Chien Chen

1995-12-01T23:59:59.000Z

272

Analytical Electron Microscopy examination of uranium contamination at the DOE Fernald operation site  

SciTech Connect

Analytical Electron Microscopy (AEM) has been used to identify uranium-bearing phases present in contaminated soils from the DOE Fernald operation site. A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and AEM was used in isolating and characterizing uranium-rich regions of the contaminated soils. Soil samples were prepared for transmission electron microscopy (TEM) by ultramicrotomy using an embedding resin previously employed for aquatic colloids and biological samples. This preparation method allowed direct comparison between SEM and TEM images. At the macroscopic level much of the uranium appears to be associated with clays in the soils; however, electron beam analysis revealed that the uranium is present as discrete phases, including iron oxides, silicates (soddyite), phosphates (autunites), and fluorite. Only low levels of uranium were actually within the clay minerals. The distribution of uranium phases was inhomogeneous at the submicron level.

Buck, E.C.; Dietz, N.L.; Bates, J.K.; Cunnane, J.C.

1993-02-01T23:59:59.000Z

273

Scan Energy AS | Open Energy Information  

Open Energy Info (EERE)

Scan Energy AS Jump to: navigation, search Name Scan Energy AS Place Dybvad, Denmark Zip DK-9352 Sector Solar, Wind energy Product Denmark-based solar and wind power project...

274

Demonstration of Ballistic Electron Emission Microscopy / Spectroscopy on the Au/Si (001) system  

E-Print Network (OSTI)

The Ballistic Electron Emission Microscopy (BEEM) capabilities of a Scanning Tunneling Microscope (STM) have been verified. BEEM is used to analyze the characteristics of buried energy barriers and was developed as an extension of scanning tunneling microscopy; hence, the analytical capabilities of BEEM are on a manometer scale. To use BEEM, low-noise Au/Si (001) Schottky diodes have been fabricated. The diodes were macroscopically tested for their electrical properties using conventional current-voltage (I-V) techniques. The same diodes were then placed in an ultra-high vacuum STM system and analyzed with BEEM. The ballistic electron emission microscopy and scanning tunneling microscopy showed some correlation with the topography of the evaporated gold surface. The barrier heights of the diodes were extracted from the ballistic electron emission spectroscopy with the use of a simple one dimensional BEEM current model. Comparison between the barrier heights obtained with BEEM and conventional I-V techniques showed the localized barrier heights to be higher than the macroscopic barrier heights.

Drummond, Mary Alyssa

1997-01-01T23:59:59.000Z

275

ARM: Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)  

DOE Data Explorer (OSTI)

Ka-Band Scanning ARM Cloud Radar (KASACR) Hemispherical Sky RHI Scan (6 horizon-to-horizon scans at 30-degree azimuth intervals)

Nitin Bharadwaj; Kevin Widener

276

N-detection under transparent-scan  

Science Conference Proceedings (OSTI)

We study the quality of test sequences under a test application scheme called transparent-scan as n -detection test sequences. We obtain transparent-scan sequences from combinational test sets. We show that for the same number of clock cycles ... Keywords: n-detection test sets, scan design, test generation

Irith Pomeranz

2005-06-01T23:59:59.000Z

277

Transmission Electron Microscopy Study of InN Nanorods  

E-Print Network (OSTI)

Transmission Electron Microscopy Study of InN Nanorods Z.epitaxy and studied by transmission electron microscopy,establish their quality. Transmission electron microscopy (

Liliental-Weber, Z.; Li, X.; Kryliouk, Olga; Park, H.J.; Mangum, J.; Anderson, T.

2008-01-01T23:59:59.000Z

278

Scanning ARM Cloud Radar Handbook  

SciTech Connect

The scanning ARM cloud radar (SACR) is a polarimetric Doppler radar consisting of three different radar designs based on operating frequency. These are designated as follows: (1) X-band SACR (X-SACR); (2) Ka-band SACR (Ka-SACR); and (3) W-band SACR (W-SACR). There are two SACRs on a single pedestal at each site where SACRs are deployed. The selection of the operating frequencies at each deployed site is predominantly determined by atmospheric attenuation at the site. Because RF attenuation increases with atmospheric water vapor content, ARM's Tropical Western Pacific (TWP) sites use the X-/Ka-band frequency pair. The Southern Great Plains (SGP) and North Slope of Alaska (NSA) sites field the Ka-/W-band frequency pair. One ARM Mobile Facility (AMF1) has a Ka/W-SACR and the other (AMF2) has a X/Ka-SACR.

Widener, K; Bharadwaj, N; Johnson, K

2012-06-18T23:59:59.000Z

279

Frontiers of In Situ Transmission Electron Microscopy  

Science Conference Proceedings (OSTI)

... significance and versatility of in situ transmission electron microscopy (TEM) has ... applied stimulus is observed as it happens inside the microscope. ...

2013-05-29T23:59:59.000Z

280

Maximizing fluorescence collection efficiency in multiphoton microscopy  

E-Print Network (OSTI)

-depth limit in two-photon microscopy," J. Opt. Soc. Am. A 23(12), 3139­3149 (2006). 9. D. Kobat, M. E. Durst

Levene, Michael J.

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


281

Grand Opening Slated for Electron Microscopy Facility  

Science Conference Proceedings (OSTI)

4 days ago ... The Ohio State University Center for Electron Microscopy and Analysis ... There are also two X-ray diffractometer (XRD) systems, facilities for ...

282

ScanningTunneling Luminescence of Grain Boundaries in Cu(In,Ga)Se2  

DOE Green Energy (OSTI)

At the Laboratory, photon emission in semiconductors has been mapped in the nanoscale using scanning tunneling microscopy (STM). In this Solar Program Review Meeting, we report on the latest results obtained in Cu(In,Ga)Se2 (CIGS) thin films by this adapted STM. Scanning tunneling luminescence (STL) spectroscopy suggests that photons are emitted near the surface of CIGS. STL is excited either by (1) diffusion of tunneling electrons and subsequent recombination with available holes in CIGS or (2) impact ionization by hot electrons. Which process becomes predominant depends on the voltage applied to the STM tip. Photon mapping shows electronically active, extended defects near the surface of CIGS thin films.

Romero, M. J.; Jiang, C.-S.; Al-Jassim, M. M.; Noufi, R.

2005-01-01T23:59:59.000Z

283

Method for motion tracking during tomographic scanning  

Method for motion tracking during tomographic scanning Note: The technology described above is an early stage opportunity. Licensing rights to this intellectual ...

284

Nanomaterials Analysis using a Scanning Electron Microscope ...  

NLE Websites -- All DOE Office Websites (Extended Search)

Nanomaterials Analysis using a Scanning Electron Microscope Technology available for licensing: Steradian X-ray detection system increases the detection capability of SEMs during...

285

CARS polarized microscopy of three-dimensional director structures in liquid crystals  

E-Print Network (OSTI)

We demonstrate three-dimensional vibrational imaging of director structures in liquid crystals using coherent anti-Stokes Raman scattering (CARS) polarized microscopy. Spatial mapping of the structures is based on sensitivity of a polarized CARS signal to orientation of anisotropic molecules in liquid crystals. As an example, we study structures in a smectic material and demonstrate that single-scan CARS and two-photon fluorescence images of molecular orientation patterns are consistent with each other and with the structure model.

Kachynski, A V; Prasad, P N; Smalyukh, I I

2007-01-01T23:59:59.000Z

286

CARS polarized microscopy of three-dimensional director structures in liquid crystals  

E-Print Network (OSTI)

We demonstrate three-dimensional vibrational imaging of director structures in liquid crystals using coherent anti-Stokes Raman scattering (CARS) polarized microscopy. Spatial mapping of the structures is based on sensitivity of a polarized CARS signal to orientation of anisotropic molecules in liquid crystals. As an example, we study structures in a smectic material and demonstrate that single-scan CARS and two-photon fluorescence images of molecular orientation patterns are consistent with each other and with the structure model.

A. V. Kachynski; A. N. Kuzmin; P. N. Prasad; I. I. Smalyukh

2007-10-18T23:59:59.000Z

287

Laser Scanning Two Photon and Confocal Microscope  

Science Conference Proceedings (OSTI)

... The SP5 is a laser scanning two-photon and confocal microscope equipped with ... nm HeNe, and tunable IR (680 nm - 1060 nm) lasers * 4 internal ...

2012-10-01T23:59:59.000Z

288

Frequency Scanned Interferometry for ILC Tracker Alignment  

E-Print Network (OSTI)

In this paper, we report high-precision absolute distance and vibration measurements performed with frequency scanned interferometry. Absolute distance was determined by counting the interference fringes produced while scanning the laser frequency. High-finesse Fabry-Perot interferometers were used to determine frequency changes during scanning. A dual-laser scanning technique was used to cancel drift errors to improve the absolute distance measurement precision. A new dual-channel FSI demonstration system is also presented which is an interim stage toward practical application of multi-channel distance measurement. Under realistic conditions, a precision of 0.3 microns was achieved for an absolute distance of 0.57 meters. A possible optical alignment system for a silicon tracker is also presented.

Hai-Jun Yang; Tianxiang Chen; Keith Riles

2011-09-12T23:59:59.000Z

289

4.1 Search and Scan Facility  

NLE Websites -- All DOE Office Websites (Extended Search)

2 Tuning of the Up: 4. Special Features Previous: 4. Special Features Contents 4.1 Search and Scan Facility The level-of-detail support provided in SLOG-2 and Jumpshot-4's timeline...

290

Transmission Electron Microscope and Scanning Electron Microscopes -  

NLE Websites -- All DOE Office Websites (Extended Search)

Facilities > Transmission Electron Facilities > Transmission Electron Microscope and Scanning Electron Microscopes FACILITIES Transmission Electron Microscope and Scanning Electron Microscopes Overview Other Facilities Work with Argonne Contact us For Employees Site Map Help Join us on Facebook Follow us on Twitter NE on Flickr Transmission Electron Microscope and Scanning Electron Microscopes The research activities of the Corrosion and Mechanics of Materials Section are supported by complete metallography/sample preparation rooms equipped with several optical and electron microscopes: a Transmission Electron Microscope and two Scanning Electron Microscopes. Bookmark and Share Transmission electron microscope (TEM) Detail of JEOL 100CXII TEM Figure 1: Detail of JEOL 100CXII TEM. Click on image to view larger image.

291

The FTS scans that made up the  

E-Print Network (OSTI)

Kitt Peak Solar Flux Atlas by Kurucz, Furenlid, Brault, and Testerman 1984 have been re-reduced. The scans listed in Table 1 ( = Figure 0) were smoothed with a 3-point Gaussian to simplify continuum placement and matching overlapping scans. An approximate atmospheric model was determined for each FTS scan. Large-scale features produced by O3 and O2 dimer were computed and divided out. The telluric line spectrum was computed using HITRAN and other line data for H2O, O2, and CO2. The line parameters were adjusted for an approximate match to the observed spectra. The wavelength scale for the scans was redetermined. The solar continuum level was found by fitting a smooth curve to high points in the observed spectrum while comparing with the product of the computed solar spectrum times the computed telluric spectrum. The spectrum was normalized to the fitted continuum to produce a residual flux spectrum for each FTS scan. Those scans were divided by the computed telluric spectra to produce residual irradiance spectra. Artifacts from wavelength mismatches, deep lines, etc, were removed by hand and replaced by

Robert L. Kurucz

2005-01-01T23:59:59.000Z

292

H2Scan LLC | Open Energy Information  

Open Energy Info (EERE)

H2Scan LLC H2Scan LLC Jump to: navigation, search Name H2Scan LLC Place Valencia, California Zip 91355 Sector Hydro, Hydrogen Product Hydrogen specific sensing systems, uniquely able to detect hydrogen against virtually any background gases. Coordinates 39.468791°, -0.376913° Loading map... {"minzoom":false,"mappingservice":"googlemaps3","type":"ROADMAP","zoom":14,"types":["ROADMAP","SATELLITE","HYBRID","TERRAIN"],"geoservice":"google","maxzoom":false,"width":"600px","height":"350px","centre":false,"title":"","label":"","icon":"","visitedicon":"","lines":[],"polygons":[],"circles":[],"rectangles":[],"copycoords":false,"static":false,"wmsoverlay":"","layers":[],"controls":["pan","zoom","type","scale","streetview"],"zoomstyle":"DEFAULT","typestyle":"DEFAULT","autoinfowindows":false,"kml":[],"gkml":[],"fusiontables":[],"resizable":false,"tilt":0,"kmlrezoom":false,"poi":true,"imageoverlays":[],"markercluster":false,"searchmarkers":"","locations":[{"text":"","title":"","link":null,"lat":39.468791,"lon":-0.376913,"alt":0,"address":"","icon":"","group":"","inlineLabel":"","visitedicon":""}]}

293

WorldScan | Open Energy Information  

Open Energy Info (EERE)

WorldScan WorldScan Jump to: navigation, search LEDSGP green logo.png FIND MORE DIA TOOLS This tool is part of the Development Impacts Assessment (DIA) Toolkit from the LEDS Global Partnership. Tool Summary LAUNCH TOOL Name: WorldScan Agency/Company /Organization: Netherlands Bureau for Economic Policy Analysis (CPB) Sector: Climate, Energy Complexity/Ease of Use: Moderate Website: www.gtap.agecon.purdue.edu/resources/res_display.asp?RecordID=1923 Related Tools Marginal Abatement Cost Tool (MACTool) Greenhouse Gas and Air Pollution Interactions and Synergies (GAINS) Gold Standard Program Model ... further results A recursively dynamic general equilibrium model for the world economy, developed for the analysis of long-term issues in international economics; used both as a tool to construct long-term scenarios and as an instrument

294

Scanning capacitance microscopy of AlGaN/GaN heterostructure field-effect transistor epitaxial layer structures  

E-Print Network (OSTI)

, University of California, San Diego, La Jolla, California, 92093-0407 J. M. Redwing and K. S. Boutros ATMI

Yu, Edward T.

295

Scanning Probe Recognition Microscopy -A New Tool for Quantitative Mapping of Nanoscale Properties in Regenerative Neural Cell Systems  

E-Print Network (OSTI)

in Regenerative Neural Cell Systems Virginia M. Ayres, V. Tiryaki, Michigan State University; A. Khan, Western) [2] Astrocytes on 2D substrates have a pathological morphology (A). Astrocytes on 3D nanofibrillar Purdue University, and her B.A. in Physics and Biophysics from the Johns Hopkins University. She

Ayres, Virginia

296

Classification of Multiple Types of Organic Carbon Composition in Atmospheric Particles by Scanning Transmission X-Ray Microscopy Analysis  

E-Print Network (OSTI)

al. , 2005), and biomass combustion (Braun, 2005; Tivanskigenerated from biomass (wood) combustion, however, it is

Takahama, S.

2008-01-01T23:59:59.000Z

297

Scanning and storage of electrophoretic records  

SciTech Connect

An electrophoretic record that includes at least one gel separation is mounted for motion laterally of the separation record. A light source is positioned to illuminate at least a portion of the record, and a linear array camera is positioned to have a field of view of the illuminated portion of the record and orthogonal to the direction of record motion. The elements of the linear array are scanned at increments of motion of the record across the field of view to develop a series of signals corresponding to intensity of light at each element at each scan increment.

McKean, Ronald A. (Royal Oak, MI); Stiegman, Jeff (Ann Arbor, MI)

1990-01-01T23:59:59.000Z

298

Scanning and Mapping Strategies for CMB Experiments  

E-Print Network (OSTI)

CMB anisotropy experiments seeking to make maps with more pixels than the 6144 pixels used by the COBE DMR need to address the practical issues of the computer time and storage required to make maps. A simple, repetitive scan pattern reduces these requirements but leaves the experiment vulnerable to systematic errors and striping in the maps. In this paper I give a time-ordered method for map-making with one-horned experiments that has reasonable memory and CPU needs but can handle complex COBE-like scans paths and 1/f noise.

Edward L. Wright

1996-11-29T23:59:59.000Z

299

Scanned_Joint_Declaration_(Italian).pdf | Department of Energy  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

JointDeclaration(Italian).pdf ScannedJointDeclaration(Italian).pdf ScannedJointDeclaration(Italian).pdf More Documents & Publications FTCP Face to Face Meeting - March 30,...

300

Scanning the Technology Energy Infrastructure Defense Systems  

E-Print Network (OSTI)

of their own telecommunications systems, which often consist of backbone fiber-optic or microwave connectingScanning the Technology Energy Infrastructure Defense Systems MASSOUD AMIN, SENIOR MEMBER, IEEE systems and to develop de- fense plans to protect the network against extreme contingencies caused

Amin, S. Massoud

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


301

PNNL SA 95506 Scan to learn more  

E-Print Network (OSTI)

PNNL SA 95506 Scan to learn more www.pnnl.gov At Pacific Northwest National Laboratory, we are transforming the world through courageous discovery and innovation. The evidence is all around us. PNNL called PNNL) developed the standards and devices for setting and measuring radiation doses received

302

Argonne CNM Highlight: Light Scattering by Nanoparticles  

NLE Websites -- All DOE Office Websites (Extended Search)

Light Scattering by Nanoparticles: Understanding Confinement of Light for Nanophotonics Applications through Near-Field Scanning Optical Microscopy Light Scattering by Nanoparticles: Understanding Confinement of Light for Nanophotonics Applications through Near-Field Scanning Optical Microscopy Schematic of the apertureless near-field optical microscope Schematic of the apertureless near-field optical microscope. The optical scattering from the AFM probe tip provides the subdiffraction-limited optical field information. One of the motivations of nanoscience is to achieve sufficient control over photon propagation in nanostructures so as to effectively replace the electron with the photon in all-optical integrated circuits. The much greater speed and bandwidth of light pulses versus electrons promise new capabilities and size reduction of photon based “electronics.” Arrays of metal nanoparticles are currently considered a leading candidate for photon

303

Scanning electron microscopic analyses of Ferrocyanide tank wastes for the Ferrocyanide safety program  

Science Conference Proceedings (OSTI)

This is Fiscal Year 1995 Annual Report on the progress of activities relating to the application of scanning electron microscopy in addressing the Ferrocyanide Safety Issue associated with Hanford Site high-level radioactive waste tanks. The status of the FY 1995 activities directed towards establishing facilities capable of providing SEM based micro-characterization of ferrocyanide tank wastes is described. A summary of key events in the SEM task over FY 1995 and target activities in FY 1996 are presented. A brief overview of the potential applications of computer controlled SEM analytical data in light of analyses of ferrocyanide simulants performed by an independent contractor is also presented

Callaway, W.S.

1995-09-01T23:59:59.000Z

304

Interactive visualization for network and port scan detection  

Science Conference Proceedings (OSTI)

Many times, network intrusion attempts begin with either a network scan, where a connection is attempted to every possible destination in a network, or a port scan, where a connection is attempted to each port on a given destination. Being able to detect ... Keywords: information visualization, intrusion detection, network scans, network security, port scans, user interfaces

Chris Muelder; Kwan-Liu Ma; Tony Bartoletti

2005-09-01T23:59:59.000Z

305

Rapid Scan AERI Observations: Benefits and Analysis  

NLE Websites -- All DOE Office Websites (Extended Search)

Rapid Scan AERI Observations: Benefits and Analysis Rapid Scan AERI Observations: Benefits and Analysis W. F. Feltz, D. D. Turner, R. O. Knuteson, and R. G. Dedecker Space Science and Engineering Center Cooperative Institute of Mesoscale Meteorological Studies University of Wisconsin-Madison Madison, Wisconsin D. D. Turner Pacific Northwest National Laboratory Richland, Washington Introduction The U.S. Department of Energy's (DOE's) Atmospheric Radiation Measurement (ARM) Program has funded the development of the atmospheric emitted radiance interferometer (AERI). This has led to a hardened, autonomous system that measures downwelling infrared (IR) radiance at high-spectral resolution. Seven AERI systems have been deployed around the world as part of the ARM Program. The initial goal of these instruments was to characterize the clear-sky IR emission from the atmosphere,

306

High-speed massively parallel scanning  

DOE Patents (OSTI)

A new technique for recording a series of images of a high-speed event (such as, but not limited to: ballistics, explosives, laser induced changes in materials, etc.) is presented. Such technique(s) makes use of a lenslet array to take image picture elements (pixels) and concentrate light from each pixel into a spot that is much smaller than the pixel. This array of spots illuminates a detector region (e.g., film, as one embodiment) which is scanned transverse to the light, creating tracks of exposed regions. Each track is a time history of the light intensity for a single pixel. By appropriately configuring the array of concentrated spots with respect to the scanning direction of the detection material, different tracks fit between pixels and sufficient lengths are possible which can be of interest in several high-speed imaging applications.

Decker, Derek E. (Byron, CA)

2010-07-06T23:59:59.000Z

307

Laser scanning system for object monitoring  

DOE Patents (OSTI)

A laser scanner is located in a fixed position to have line-of-sight access to key features of monitored objects. The scanner rapidly scans pre-programmed points corresponding to the positions of retroreflecting targets affixed to the key features of the objects. The scanner is capable of making highly detailed scans of any portion of the field of view, permitting the exact location and identity of targets to be confirmed. The security of an object is verified by determining that the cooperative target is still present and that its position has not changed. The retroreflecting targets also modulate the reflected light for purposes of returning additional information back to the location of the scanner.

McIntyre, Timothy James [Knoxville, TN; Maxey, Lonnie Curtis [Powell, TN; Chiaro, Jr; John, Peter [Clinton, TN

2008-04-22T23:59:59.000Z

308

Circular zig-zag scan video format  

DOE Patents (OSTI)

A circular, ziz-zag scan for use with vidicon tubes. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal.

Peterson, C. Glen (Los Alamos, NM); Simmons, Charles M. (Los Alamos, NM)

1992-01-01T23:59:59.000Z

309

Quantitative imaging of living cells by deep ultraviolet microscopy  

E-Print Network (OSTI)

Developments in light microscopy over the past three centuries have opened new windows into cell structure and function, yet many questions remain unanswered by current imaging approaches. Deep ultraviolet microscopy ...

Zeskind, Benjamin J

2006-01-01T23:59:59.000Z

310

Range-gated imaging for near-field target identification  

Science Conference Proceedings (OSTI)

The combination of two complementary technologies developed independently at Los Alamos National Laboratory (LANL) and Sandia National Laboratory (SNL) has demonstrated feasibility of target detection and image capture in a highly light-scattering, medium. The technique uses a compact SNL developed Photoconductive Semiconductor Switch/Laser Diode Array (PCSS/LDA) for short-range (distances of 8 to 10 m) large Field-Of-View (FOV) target illumination. Generation of a time-correlated echo signal is accomplished using a photodiode. The return image signal is recorded with a high-speed shuttered Micro-Channel-Plate Image Intensifier (MCPII), declined by LANL and manufactured by Philips Photonics. The MCPII is rated using a high-frequency impedance-matching microstrip design to produce 150 to 200 ps duration optical exposures. The ultra first shuttering producer depth resolution of a few inches along the optic axis between the MCPII and the target, producing enhanced target images effectively deconvolved from noise components from the scattering medium in the FOV. The images from the MCPII are recorded with an RS-170 Charge-Coupled-Device camera and a Big Sky, Beam Code, PC-based digitizer frame grabber and analysis package. Laser pulse data were obtained by the but jitter problems and spectral mismatches between diode spectral emission wavelength and MCPII photocathode spectral sensitivity prevented the capture of fast gating imaging with this demonstration system. Continued development of the system is underway.

Yates, G.J.; Gallegos, R.A.; McDonald, T.E. [and others

1996-12-01T23:59:59.000Z

311

Near field optical probe for critical dimension measurements  

DOE Patents (OSTI)

A resonant planar optical waveguide probe for measuring critical dimensions on an object in the range of 100 nm and below is disclosed. The optical waveguide includes a central resonant cavity flanked by Bragg reflector layers with input and output means at either end. Light is supplied by a narrow bandwidth laser source. Light resonating in the cavity creates an evanescent electrical field. The object with the structures to be measured is translated past the resonant cavity. The refractive index contrasts presented by the structures perturb the field and cause variations in the intensity of the light in the cavity. The topography of the structures is determined from these variations. 8 figs.

Stallard, B.R.; Kaushik, S.

1999-05-18T23:59:59.000Z

312

Direct-Write Piezoelectric Nanogenerator by Near-Field Electrospinning  

E-Print Network (OSTI)

37] V. H. Schmidt, “Piezoelectric energy conversion inenergy harvesting applications by constructing piezoelectricpiezoelectric nanogenerators for possible applications of energy

Chang, Chieh

2009-01-01T23:59:59.000Z

313

Electron Microscopy Study of Tin Whisker Growth  

Science Conference Proceedings (OSTI)

The growth of tin whiskers formed on sputtered tin layers deposited on brass was studied using electron microscopy. The occurrence of whiskers appeared to be largely independent of the macroscopic stress state in the film; rather it was microscopic compressive stresses arising from the formation of an intermetallic phase that appeared to be the necessary precursor. Whisker morphology was a result of whether nucleation had occurred on single grains or on multiple grains. In the latter case, the whiskers had a fluted or striated surface. The formation of whiskers on electron transparent samples was demonstrated. These samples showed the whiskers were monocrystalline and defect free, and that the growth direction could be determined.

Norton, Murray G. (Washington State University); Lebret, Joel (8392)

2003-03-30T23:59:59.000Z

314

Public Safety and Security in Analytical Microscopy Group  

Science Conference Proceedings (OSTI)

Public Safety and Security in Analytical Microscopy Group. Summary: Reliable standards are needed to test, maintain, and ...

2012-10-02T23:59:59.000Z

315

Depth Charge: Using Atomic Force Microscopy to Study ...  

Science Conference Proceedings (OSTI)

... right circumstances, surface science instruments such ... Electric force microscopy can be used to ... superior strength and electrical conductance, added ...

2010-10-05T23:59:59.000Z

316

Electron and X-Ray Microscopy: Structural Characterization of ...  

Science Conference Proceedings (OSTI)

Oct 28, 2009 ... Recent Advances in Structural Characterization of Materials: Electron and X-Ray Microscopy: Structural Characterization of Nanoscale ...

317

Opportunities for Multimodal CARS Microscopy in Materials Science  

Science Conference Proceedings (OSTI)

Symposium, Optical and X-ray Imaging Techniques for Material Characterization. Presentation Title, Opportunities for Multimodal CARS Microscopy in Materials ...

318

Comparison of Segmentation Algorithms For Fluorescence Microscopy Images of Cells  

E-Print Network (OSTI)

Comparison of Segmentation Algorithms For Fluorescence Microscopy Images of Cells Alden A. Dima,1 Mary C. Brady,1 Hai C. Tang,1 Anne L. Plant2 * Abstract The analysis of fluorescence microscopy fluorescence microscopy; k-means cluster; image segmentation; cell edge; bivariate simi- larity index NUMEROUS

Bernal, Javier

319

Imaging doped silicon test structures using low energy electron microscopy.  

SciTech Connect

This document is the final SAND Report for the LDRD Project 105877 - 'Novel Diagnostic for Advanced Measurements of Semiconductor Devices Exposed to Adverse Environments' - funded through the Nanoscience to Microsystems investment area. Along with the continuous decrease in the feature size of semiconductor device structures comes a growing need for inspection tools with high spatial resolution and high sample throughput. Ideally, such tools should be able to characterize both the surface morphology and local conductivity associated with the structures. The imaging capabilities and wide availability of scanning electron microscopes (SEMs) make them an obvious choice for imaging device structures. Dopant contrast from pn junctions using secondary electrons in the SEM was first reported in 1967 and more recently starting in the mid-1990s. However, the serial acquisition process associated with scanning techniques places limits on the sample throughput. Significantly improved throughput is possible with the use of a parallel imaging scheme such as that found in photoelectron emission microscopy (PEEM) and low energy electron microscopy (LEEM). The application of PEEM and LEEM to device structures relies on contrast mechanisms that distinguish differences in dopant type and concentration. Interestingly, one of the first applications of PEEM was a study of the doping of semiconductors, which showed that the PEEM contrast was very sensitive to the doping level and that dopant concentrations as low as 10{sup 16} cm{sup -3} could be detected. More recent PEEM investigations of Schottky contacts were reported in the late 1990s by Giesen et al., followed by a series of papers in the early 2000s addressing doping contrast in PEEM by Ballarotto and co-workers and Frank and co-workers. In contrast to PEEM, comparatively little has been done to identify contrast mechanisms and assess the capabilities of LEEM for imaging semiconductor device strictures. The one exception is the work of Mankos et al., who evaluated the impact of high-throughput requirements on the LEEM designs and demonstrated new applications of imaging modes with a tilted electron beam. To assess its potential as a semiconductor device imaging tool and to identify contrast mechanisms, we used LEEM to investigate doped Si test structures. In section 2, Imaging Oxide-Covered Doped Si Structures Using LEEM, we show that the LEEM technique is able to provide reasonably high contrast images across lateral pn junctions. The observed contrast is attributed to a work function difference ({Delta}{phi}) between the p- and n-type regions. However, because the doped regions were buried under a thermal oxide ({approx}3.5 nm thick), e-beam charging during imaging prevented quantitative measurements of {Delta}{phi}. As part of this project, we also investigated a series of similar test structures in which the thermal oxide was removed by a chemical etch. With the oxide removed, we obtained intensity-versus-voltage (I-V) curves through the transition from mirror to LEEM mode and determined the relative positions of the vacuum cutoffs for the differently doped regions. Although the details are not discussed in this report, the relative position in voltage of the vacuum cutoffs are a direct measure of the work function difference ({Delta}{phi}) between the p- and n-doped regions.

Nakakura, Craig Yoshimi; Anderson, Meredith Lynn; Kellogg, Gary Lee

2010-01-01T23:59:59.000Z

320

Circular zig-zag scan video format  

DOE Patents (OSTI)

This invention is comprised of a circular, zig-zag scan for use with vidicon tubes. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal.

Peterson, C.G.; Simmons, C.M.

1991-03-21T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


321

Circular zig-zag scan video format  

DOE Patents (OSTI)

A circular, ziz-zag scan for use with vidicon tubes is disclosed. A sine wave is generated, rectified and its fourth root extracted. The fourth root, and its inverse, are used to generate horizontal ramp and sync signals. The fourth root is also used to generate a vertical sync signal, and the vertical sync signal, along with the horizontal sync signal, are used to generate the vertical ramp signal. Cathode blanking and preamplifier clamp signals are also obtained from the vertical sync signal. 10 figs.

Peterson, C.G.; Simmons, C.M.

1992-06-09T23:59:59.000Z

322

Mapping Ionic Currents and Reactivity on the Nanoscale: Electrochemical Strain Microscopy  

DOE Green Energy (OSTI)

Solid-state electrochemical processes in oxides underpin a broad spectrum of energy and information storage devices, ranging from Li-ion and Li-air batteries, to solid oxide fuel cells (SOFC) to electroresistive and memristive systems. These functionalities are controlled by the bias-driven diffusive and electromigration transport of mobile ionic species, as well as intricate a set of electrochemical and defect-controlled reactions at interfaces and in bulk. Despite the wealth of device-level and atomistic studies, little is known on the mesoscopic mechanisms of ion diffusion and electronic transport on the level of grain clusters, individual grains, and extended defects. The development of the capability for probing ion transport on the nanometer scale is a key to deciphering complex interplay between structure, functionality, and performance in these systems. Here we introduce Electrochemical Strain Microscopy, a scanning probe microscopy technique based on strong strain-bias coupling in the systems in which local ion concentrations are changed by electrical fields. The imaging capability, as well as time- and voltage spectroscopies analogous to traditional current based electrochemical characterization methods are developed. The reversible intercalation of Li and mapping electrochemical activity in LiCoO2 is demonstrated, illustrating higher Li diffusivity at non-basal planes and grain boundaries. In Si-anode device structure, the direct mapping of Li diffusion at extended defects and evolution of Li-activity with charge state is explored. The electrical field-dependence of Li mobility is studied to determine the critical bias required for the onset of electrochemical transformation, allowing reaction and diffusion processes in the battery system to be separated at each location. Finally, the applicability of ESM for probing oxygen vacancy diffusion and oxygen reduction/evolution reactions is illustrated, and the high resolution ESM maps are correlated with aberration corrected scanning transmission electron microscopy imaging. The future potential for deciphering mechanisms of electrochemical transformations on an atomically-defined single-defect level is discussed.

Kalinin, S.V. (Center for Nanophase Materials Sciences, ORNL)

2010-10-19T23:59:59.000Z

323

A facile electron microscopy method for measuring precipitate volume fractions in AlCuMg alloys  

SciTech Connect

Precipitate volume fraction is an important parameter to estimate the strength of precipitation-hardened metals. In this study, a facile method was applied to measure the precipitate volume fractions in an age-hardened AlCuMg alloy. In this method, the precipitate volume fraction values can be obtained by multiplying the volume precipitate number densities with the averaged precipitate volumes, which can be easily measured in scanning electron microscopy and transmission electron microscopy, respectively. Compared with the conventional method, in which the specimen thickness has to be measured in transmission electron microscopy, the method proposed in this study is more facile to perform. - Highlights: Black-Right-Pointing-Pointer We have proposed a facile method to measure precipitate volume fractions for precipitation-hardened metals. Black-Right-Pointing-Pointer This technique works well for the square-shaped {theta} Prime -phase nano-precipitates in 2xxx aluminum alloys. Black-Right-Pointing-Pointer Interesting is that the proposed method is easy for materials scientists and engineers to perform.

Zhao, X.Q.; Shi, M.J.; Chen, J.H., E-mail: jhchen123@hnu.edu.cn; Wang, S.B.; Liu, C.H.; Wu, C.L.

2012-07-15T23:59:59.000Z

324

NCEM National Center for Electron Microscopy: Staff  

NLE Websites -- All DOE Office Websites (Extended Search)

Staff Staff Scientific Technical / Admin. Postdoctoral and Visitors Uli Dahmen, Head Jane Cavlina / Administrator Abhay Gautam Christian Kisielowski John Turner Helmut Poppa Andrew Minor ChengYu Song Frances Allen Andreas Schmid Marissa Libbee Tamara Radetic Peter Ercius Karen Bustillo Haimei Zheng Jim Ciston Alpha N'Diaye Colin Ophus Gong Chen Burak Ozdol Velimir Radmilovic Sara Kiani Hua Guo Christian Liebscher Josh Kacher Chris Nelson Xiuguang Jin Qian Yu Mary Scott Search the LBNL directory services page for other LBNL staff. Scientific Staff Uli Dahmen udahmen@lbl.gov (510) 486-4627 Ulrich Dahmen is Director of the National Center for Electron Microscopy. His current research interests include embedded nanostructures and interfaces in materials. Embedded nanostructures. Size- and shape-dependence of structural phase

325

A System Level Boundary Scan Controller Board for VME Applications  

Science Conference Proceedings (OSTI)

In this article an application of boundary scan test at system level is analyzed. The objective is met through the description of the design and implementation options of a VME boundary scan controller board prototype and the corresponding software. ... Keywords: ATPG, IEEE 1149.1 boundary scan test, board level test and system level test

Nuno Cardoso; Carlos Beltrán Almeida; José Carlos Da Silva

2001-06-01T23:59:59.000Z

326

Phase contrast in high resolution electron microscopy  

DOE Patents (OSTI)

This patent relates to a device for developing a phase contrast signal for a scanning transmission electron microscope. The lens system of the microscope is operated in a condition of defocus so that predictable alternate concentric regions of high and low electron density exist in the cone of illumination. Two phase detectors are placed beneath the object inside the cone of illumination, with the first detector having the form of a zone plate, each of its rings covering alternate regions of either higher or lower electron density. The second detector is so configured that it covers the regions of electron density not covered by the first detector. Each detector measures the number of electrons incident thereon and the signal developed by the first detector is subtracted from the signal developed by the record detector to provide a phase contrast signal. (auth)

Rose, H.H.

1975-09-23T23:59:59.000Z

327

Copy of Bound Original For Scanning  

Office of Legacy Management (LM)

Copy of Bound Original Copy of Bound Original For Scanning Document # 1\1\ i g -b DOE/El/-0005/6 Formerly Utilized IVIEWAEC Site! Remedial Action Progrhn, F@diilogical Survey of the Seaway Industrial Par Tonawanda, New Yor May 197 Final Repel Prepared f U.S. Department of Enerc Assistant Secretary for Environme Division of Environmental Control Technolo Washington, D.C. 205, uric Contract No. W-7405-ENG- - - - Available from: ' : -. National Technical Information Service (NTIS) U.S. Department of Comnerce 5285 Port Royal Road Springfield, Virginia 22161 price: Printed Copy: $ 5.25 Microffche: $ 3.00 PREFACE This series of reports results from a program initiated in 1974 by the Atomic Energy Commission (AEC) for determination of the condition of sites formerly utilized by the Manhattan Engineering District &ED)

328

Results from STAR Beam Energy Scan Program  

E-Print Network (OSTI)

Results from the Beam Energy Scan (BES) program conducted recently by STAR experiment at RHIC are presented. The data from Phase-I of the BES program collected in Au+Au collisions at center-of-mass energies (\\sqrt{s_{NN}}) of 7.7, 11.5, 19.6, 27, and 39 GeV cover a wide range of baryon chemical potential ?\\mu_B (100-400 MeV) in the QCD phase diagram. Several STAR results from the BES Phase-I related to "turn-o?ff" of strongly inter- acting quark-gluon plasma (sQGP) signatures and signals of QCD phase boundary are reported. In addition to this, an outlook is presented for the future BES Phase-II program and a possible ?fixed target program at STAR.

Michal Sumbera

2013-01-30T23:59:59.000Z

329

Rapid scanning system for fuel drawers  

DOE Patents (OSTI)

A nondestructive method for uniqely distinguishing among and quantifying the mass of individual fuel plates in situ in fuel drawers utilized in nuclear reactors is described. The method is both rapid and passive, eliminating the personnel hazard of the commonly used irradiation techniques which require that the analysis be performed in proximity to an intense neutron source such as a reactor. In the present technique, only normally decaying nuclei are observed. This allows the analysis to be performed anywhere. This feature, combined with rapid scanning of a given fuel drawer (in approximately 30 s), and the computer data analysis allows the processing of large numbers of fuel drawers efficiently in the event of a loss alert.

Caldwell, John T. (Los Alamos, NM); Fehlau, Paul E. (Los Alamos, NM); France, Stephen W. (Los Alamos, NM)

1981-01-01T23:59:59.000Z

330

Systematic Sampling of Scanning Lidar Swaths  

E-Print Network (OSTI)

Proof of concept lidar research has, to date, examined wall-to-wall models of forest ecosystems. While these studies have been important for verifying lidars efficacy for forest surveys, complete coverage is likely not the most cost effective means of using lidar as auxiliary data for operational surveys; sampling of some sort being the better alternative. This study examines the effectiveness of sampling with high point-density scanning lidar data and shows that systematic sampling is a better alternative to simple random sampling. It examines the bias and mean squared error of various estimators, and concludes that a linear-trend-based and especially an autocorrelation-assisted variance estimator perform better than the commonly used simple random sampling based-estimator when sampling is systematic.

Marcell, Wesley Tyler

2009-12-01T23:59:59.000Z

331

Study of radiation effects on the cell structure and evaluation of the dose delivered by x-ray and {alpha}-particles microscopy  

SciTech Connect

Hard X-ray fluorescence microscopy and magnified phase contrast imaging are combined to study radiation effects on cells. Experiments were performed on freeze-dried cells at the nano-imaging station ID22NI of the European synchrotron radiation facility. Quantitative phase contrast imaging provides maps of the projected mass and is used to evaluate the structural changes due to irradiation during X-ray fluorescence experiments. Complementary to phase contrast imaging, scanning transmission ion microscopy is performed and doses of all the experiments are compared. We demonstrate the sensitivity of the proposed approach to study radiation-induced damage at the sub-cellular level.

Kosior, Ewelina; Cloetens, Peter [European Synchrotron Radiation Facility, F-38000 Grenoble (France); Deves, Guillaume; Ortega, Richard [Univ. Bordeaux, CENBG, UMR 5797, F-33170 Gradignan (France); CNRS, IN2P3, CENBG, UMR 5797, F-33170 Gradignan (France); Bohic, Sylvain [European Synchrotron Radiation Facility, 38000 Grenoble (France); INSERM U-836 (Team 6: Synchrotron Radiation and Medical Research), Grenoble Institut of Neuroscience, F-38000 Grenoble (France)

2012-12-24T23:59:59.000Z

332

A flow cell for electron microscopy imaging of specimen in ...  

A flow cell for electron microscopy imaging of specimen in liquid or gas. Note: The technology described above is an early stage opportunity. ...

333

Ultrasonic-Based Mode-Synthesizing Atomic Force Microscopy  

In a single run and without damaging the sample, ORNL’s mode-synthesizingatomic force microscopy (MSAFM), along with mode-synthesizing sensing, ...

334

NCEM National Center for Electron Microscopy: NCEM Fellowship  

NLE Websites -- All DOE Office Websites (Extended Search)

Visiting Scientist Program Visiting Scientist Program The National Center for Electron Microscopy (NCEM) offers a program that gives participants the opportunity to conduct...

335

NCEM National Center for Electron Microscopy: Workshops and Seminars  

NLE Websites -- All DOE Office Websites (Extended Search)

Upcoming Seminars Thursday, October 3, 2013 at 11am Matthew Mecklenburg Center for Electron Microscopy and MicroAnalysis, University of Southern California 2D crystals are...

336

Optical Microscopy and Spectroscopy for Material Characterization II  

Science Conference Proceedings (OSTI)

Oct 30, 2013 ... By measuring the phase of the SHG, it provides information about the relative ... We combined interferometry to SHG microscopy to retrieve the ...

337

Characterization of Battery Cycling by In-Situ Microscopy  

Science Conference Proceedings (OSTI)

Presentation Title, Characterization of Battery Cycling by In-Situ Microscopy ... of lithium ion batteries provides an important route to reducing the lifetime costs of ...

338

High Energy Diffraction Microscopy at the Advanced Photon Source ...  

Science Conference Proceedings (OSTI)

The APS 1-ID beamline is dedicated to high-energy diffraction and the status of the ... High Energy Diffraction Microscopy at the Advanced Photon Source 1-ID ...

339

In Situ Transmission Electron Microscopy Studies of Size  

Science Conference Proceedings (OSTI)

Using in situ transmission electron microscopy (TEM) nanocompression testing, we ... Ab Initio DFT Modeling of the Dislocation and Its Mobility in TiN Ceramic.

340

In Situ Aberration-Corrected Scanning Transmission Electron ...  

Science Conference Proceedings (OSTI)

Using real-time transmission electron microscopy (TEM) at atomic resolutions should shed light into some of the fundamental questions in this field.

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


341

Lansce Wire Scanning Diagnostics Device Mechanical Design  

SciTech Connect

The Accelerator Operations & Technology Division at Los Alamos National Laboratory operates a linear particle accelerator which utilizes 110 wire scanning diagnostics devices to gain position and intensity information of the proton beam. In the upcoming LANSCE improvements, 51 of these wire scanners are to be replaced with a new design, up-to-date technology and off-the-shelf components. This document outlines the requirements for the mechanical design of the LANSCE wire scanner and presents the recently developed linac wire scanner prototype. Additionally, this document presents the design modifications that have been implemented into the fabrication and assembly of this first linac wire scanner prototype. Also, this document will present the design for the second, third, and fourth wire scanner prototypes being developed. Prototypes 2 and 3 belong to a different section of the particle accelerator and therefore have slightly different design specifications. Prototype 4 is a modification of a previously used wire scanner in our facility. Lastly, the paper concludes with a plan for future work on the wire scanner development.

Rodriguez Esparza, Sergio [Los Alamos National Laboratory; Batygin, Yuri K. [Los Alamos National Laboratory; Gilpatrick, John D. [Los Alamos National Laboratory; Gruchalla, Michael E. [Los Alamos National Laboratory; Maestas, Alfred J. [Los Alamos National Laboratory; Pillai, Chandra [Los Alamos National Laboratory; Raybun, Joseph L. [Los Alamos National Laboratory; Sattler, F. D. [Los Alamos National Laboratory; Sedillo, James Daniel [Los Alamos National Laboratory; Smith, Brian G. [Los Alamos National Laboratory

2011-01-01T23:59:59.000Z

342

Positron Emission Tomography (PET) and Positron Scanning  

Office of Scientific and Technical Information (OSTI)

DOE R&D Accomplishments DOE R&D Accomplishments Search All Database Web Pages for Go The Basics Home About What's New FAQ Contact Us Laureates Nobel Laureates Fermi Laureates Nobel Physicists Nobel Chemists Medicine Nobels Explore Insights SC Stories Snapshots R&D Nuggets Database Search Browse Reports Database Help Finding Aids Site Map A - Z Index Menu Synopsis Blog Archive QR Code RSS Archive Tag Cloud Videos Widget XML Bookmark and Share Positron Emission Tomography (PET) and Positron Scanning Resources with Additional Information Positron Emission Tomography (PET) Scanner Courtesy Lawrence Berkeley National Laboratory 'Positron Emission Tomography ... [is a medical imaging technique that] can track chemical reactions in living tissues and merges chemistry with biological imaging. Its strength has been in studies of the brain where there has been significant progress in investigations of drug addiction, aging, mental illness, and neurogenic disorders. Positron Emission Tomography (PET) had its genesis in hot-atom chemical research supported by the Chemical Sciences Division of the Office of Basic Energy Sciences. Through this research it was learned, over many years, how to prepare short-lived positron emitters such as 18F whose half-life is 110 minutes. In 1975, the molecule [18F]fluorodeoxyglucose was successfully synthesized at Brookhaven National Laboratory (BNL) and set the stage for Positron Emission Tomography of the human brain.'

343

V-119: IBM Security AppScan Enterprise Multiple Vulnerabilities |  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

9: IBM Security AppScan Enterprise Multiple Vulnerabilities 9: IBM Security AppScan Enterprise Multiple Vulnerabilities V-119: IBM Security AppScan Enterprise Multiple Vulnerabilities March 26, 2013 - 12:56am Addthis PROBLEM: IBM Security AppScan Enterprise Multiple Vulnerabilities PLATFORM: IBM Rational AppScan 5.x IBM Rational AppScan 8.x ABSTRACT: IBM has acknowledged multiple vulnerabilities REFERENCE LINKS: IBM Reference #:1626264 Secunia Advisory SA52764 CVE-2008-4033 CVE-2012-4431 CVE-2012-5081 CVE-2013-0473 CVE-2013-0474 CVE-2013-0510 CVE-2013-0511 CVE-2013-0512 CVE-2013-0513 CVE-2013-0532 IMPACT ASSESSMENT: Medium DISCUSSION: 1) The application allows users to perform certain actions via HTTP requests without performing proper validity checks to verify the requests. This can be exploited to e.g. cause a DoS when a logged-in user visits a

344

Spectral-domain phase microscopy with improved sensitivity using two-dimensional detector arrays  

Science Conference Proceedings (OSTI)

In this work we demonstrate the use of two-dimensional detectors to improve the signal-to-noise ratio (SNR) and sensitivity in spectral-domain phase microscopy for subnanometer accuracy measurements. We show that an increase in SNR can be obtained, from 82 dB to 105 dB, using 150 pixel lines of a low-cost CCD camera as compared to a single line, to compute an averaged axial scan. In optimal mechanical conditions, phase stability as small as 92 {mu}rad, corresponding to 6 pm displacement accuracy, could be obtained. We also experimentally demonstrate the benefit of spatial-averaging in terms of the reduction of signal fading due to an axially moving sample. The applications of the improved system are illustrated by imaging live cells in culture.

Singh, K.; Dion, C.; Ozaki, T. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Institut National de la Recherche Scientifique, Energie, Materiaux et Telecommunications, Varennes, Quebec (Canada); Lesk, M. R. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Departement d'Ophtalmologie, Universite de Montreal, Montreal, Quebec (Canada); Costantino, S. [Centre de Recherche, Hopital Maisonneuve-Rosemont, Montreal, Quebec (Canada); Departement d'Ophtalmologie, Universite de Montreal, Montreal, Quebec (Canada); Institut de Genie Biomedical, Universite de Montreal, Montreal, Quebec (Canada)

2011-02-15T23:59:59.000Z

345

Determining Mechanical Properties of Carbon Microcoils Using Lateral Force Microscopy  

Science Conference Proceedings (OSTI)

Mechanical properties of amorphous carbon microcoil (CMC) synthesized by thermal chemical vapor deposition method were examined in compression and tension tests, using the lateral force mode of atomic force microscope (AFM). The AFM cantilever tip was ... Keywords: Atomic force microscopy (AFM), atomic force microscopy, carbon microcoil, shear modulus, spring constant

Neng-Kai Chang; Shuo-Hung Chang

2008-03-01T23:59:59.000Z

346

Feasibility and limitation of track studies using atomic force microscopy  

E-Print Network (OSTI)

Feasibility and limitation of track studies using atomic force microscopy D. Nikezic, J.P.Y. Ho, C.W.Y. Yip, V.S.Y. Koo, K.N. Yu * Department of Physics and Materials Science, City University of Hong Kong July 2002 Abstract Atomic force microscopy (AFM) has been employed to investigate characteristics

Yu, K.N.

347

NCEM National Center for Electron Microscopy: Microscopes and...  

NLE Websites -- All DOE Office Websites (Extended Search)

I The TEAM I microscope is a double-aberration-corrected (scanning) transmission electron microscope (STEMTEM) capable of producing images with 50 pm resolution. The basic...

348

Characterization of MOX Fuel Pellets by Photothermal Microscopy  

Science Conference Proceedings (OSTI)

The frequency dependence of such expansion provides information on the thermal ... Scanning the beams allows the retrieval of a map of thermal diffusivity.

349

Bone scanning in the detection of occult fractures  

SciTech Connect

The potential role of bone scanning in the early detection of occult fractures following acute trauma was investigated. Technetium 99m pyrophosphate bone scans were obtained in patients with major clinical findings and negative or equivocal roentgenograms following trauma. Bone scanning facilitated the prompt diagnosis of occult fractures in the hip, knee, wrist, ribs and costochondral junctions, sternum, vertebrae, sacrum, and coccyx. Several illustrative cases are presented. Roentgenographic confirmation occurred following a delay of days to weeks and, in some instances, the roentgenographic findings were subtle and could be easily overlooked. This study demonstrates bone scanning to be invaluable and definitive in the prompt detection of occult fractures.

Batillas, J.; Vasilas, A.; Pizzi, W.F.; Gokcebay, T.

1981-07-01T23:59:59.000Z

350

Multi-level scanning method for defect inspection  

DOE Patents (OSTI)

A method for performing scanned defect inspection of a collection of contiguous areas using a specified false-alarm-rate and capture-rate within an inspection system that has characteristic seek times between inspection locations. The multi-stage method involves setting an increased false-alarm-rate for a first stage of scanning, wherein subsequent stages of scanning inspect only the detected areas of probable defects at lowered values for the false-alarm-rate. For scanning inspection operations wherein the seek time and area uncertainty is favorable, the method can substantially increase inspection throughput.

Bokor, Jeffrey (Oakland, CA); Jeong, Seongtae (Richmond, CA)

2002-01-01T23:59:59.000Z

351

Scanning Electron Microscope 1: Zeiss Ultra-60 FESEM  

Science Conference Proceedings (OSTI)

Scanning Electron Microscope 1: Zeiss Ultra-60 FESEM. ... Secondary and backscattered electron detectors; Images structures down to 10 nm in size; ...

2013-05-30T23:59:59.000Z

352

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope  

SciTech Connect

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p {<=}10{sup -10} mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter [Department of Physics, McGill University, 3600 Rue University, Montreal, QC H3A2T8 (Canada)

2011-11-15T23:59:59.000Z

353

Electron Thermal Microscopy Todd Brintlinger,, Yi Qi, Kamal H. Baloch, David Goldhaber-Gordon,| and  

E-Print Network (OSTI)

electrical and thermal modeling. This provides a generic and adaptable platform for nanoscale thermal, probe shape, water meniscus, etc.). Near-field optical techniques4 similarly must rely on a given, as is illustrated in Figure 2. To create local temperature gradients, metal heater wires were fabricated

Goldhaber-Gordon, David

354

Gating internal nodes to reduce power during scan shift  

Science Conference Proceedings (OSTI)

It is a common practice to gate a limited number of scan cells in order to reduce overall switching activity during shift, thereby, reducing the circuit's dynamic power consumption. In this paper, we propose a novel approach to reduce overall shift power ... Keywords: gating internal nodes, low power test, scan shift power reduction

Dheepakkumaran Jayaraman; Rajamani Sethuram; Spyros Tragoudas

2010-05-01T23:59:59.000Z

355

Scan Test Response Compaction Combined with Diagnosis Capabilities  

Science Conference Proceedings (OSTI)

As today's process technologies are combined with ever increasing design sizes, the result is a dramatic increase in the number of scan test vectors that must be applied during manufacturing test. The increased chip complexities, in combination with ... Keywords: ATE, ATPG, Design for test, Diagnosis, Scan compression, Yield

Sverre Wichlund; Frank Berntsen; Einar Johan Aas

2008-06-01T23:59:59.000Z

356

Immersive mobile gaming with scanned laser pico projection systems  

Science Conference Proceedings (OSTI)

A scanned laser pico projector's advantages, in the space of motion sensed and/or mobile gaming, is explored in this paper. In order to better appreciate the applications, we first briefly delve into the operation of a MicroVision MEMS-based scanned ...

P. Selvan Viswanathan; David Lashmet; Jari Honkanen

2011-11-01T23:59:59.000Z

357

Recent Advances in Electron Microscopy, Spectral Imaging, and ...  

Science Conference Proceedings (OSTI)

... such as adhesion performance, corrosion resistance, electrical and magnetic ... and surface analysis techniques for probing the composition and structure of ... microscopy and energy dispersive X-ray spectroscopy (FESEM/STEM/EDS); ...

358

NCEM National Center for Electron Microscopy: Becoming an NCEM User  

NLE Websites -- All DOE Office Websites (Extended Search)

New Research New Research Gallery Microscopy Links Becoming an NCEM User Step 1: Submit a proposal Step 2: Before you begin your research Step 3: Instrument qualification Step 4: Accessing NCEM facilities and performing research Step 1: Submit a proposal Deadlines for new proposals are March 15, June 15, September 15, December 15. Access to NCEM facilities is granted to researchers whose proposals are accepted by the NCEM proposal review committee. NCEM users are expected to have a strong background in transmission electron microscopy, and submitted proposals should include evidence of prior electron microscopy experience by the intended operator. Researchers who do not have sufficient experience in electron microscopy may be able to use NCEM facilities through a collaborative project.

359

NCEM National Center for Electron Microscopy: Contact NCEM  

NLE Websites -- All DOE Office Websites (Extended Search)

General Contact Jane Cavlina National Center for Electron Microscopy, MS 72-150 Lawrence Berkeley National Laboratory Berkeley, CA 94720 Tel.: (510) 486-6036 Fax: (510) 486-5888...

360

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in...

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


361

Target-specific contrast agents for magnetic resonance microscopy  

E-Print Network (OSTI)

High-resolution ex vivo magnetic resonance microscopy (MRM) can be used to delineate prominent architectonic features in the human brain, but increased contrast is required to visualize more subtle distinctions. The goal ...

Hepler Blackwell, Megan Leticia

2007-01-01T23:59:59.000Z

362

Estimating Geometric Dislocation Densities in Polycrystalline Materialsfrom Orientation Imaging Microscopy  

Science Conference Proceedings (OSTI)

Herein we consider polycrystalline materials which can be taken as statistically homogeneous and whose grains can be adequately modeled as rigid-plastic. Our objective is to obtain, from orientation imaging microscopy (OIM), estimates of geometrically necessary dislocation (GND) densities.

Man, Chi-Sing [University of Kentucky; Gao, Xiang [University of Kentucky; Godefroy, Scott [University of Kentucky; Kenik, Edward A [ORNL

2010-01-01T23:59:59.000Z

363

Performance bounds on synchronous laser line scan systems  

E-Print Network (OSTI)

," in Ocean Optics VI, S. Q. Duntley, Ed., SPIE 28, (1979). 9. J. S. Jaffe, "Monte Carlo Modeling, such as optical microscopy and semiconductor wafer inspection, where more often than not, resolution is imposed

Jaffe, Jules

364

Induction of DNA Damage by Low Dose PET scans  

NLE Websites -- All DOE Office Websites (Extended Search)

Induction of DNA Damage by Low Dose PET scans Induction of DNA Damage by Low Dose PET scans Douglas Boreham McMaster University Abstract This research is focused on assessing the radiation risk associated with positron emission tomography (PET) scans. It has been suggested that low dose medical imaging, such as PET scans, carry an added biological risk because they expose the patient to ionizing radiation. PET scanning is an increasingly used nuclear medicine procedure that requires the administration of isotope 18F-fluorodeoxyglucose (18F-FDG, E=250 keV β and 511 keV γ) and results in an effective dose to the patient ranging from 7-22 mSv. The radiation induced DNA damage associated with a PET scan was studied in 7-9 week old female wild type Trp53 +/+ mice. Mice were given a PET scan with 18F-FDG and the biological response was assessed in bone marrow using

365

OBSERVATIONAL SCAN-INDUCED ARTIFICIAL COSMIC MICROWAVE BACKGROUND ANISOTROPY  

SciTech Connect

Reliably detecting the cosmic microwave background (CMB) anisotropy is of great importance in understanding the birth and evolution of the universe. One of the difficulties in CMB experiments is the domination of measured CMB anisotropy maps by the Doppler dipole moment from the motion of the antenna relative to the CMB. For each measured temperature, the expected dipole component has to be calculated separately and then subtracted from the data. A small error in dipole direction, antenna pointing direction, sidelobe pickup contamination, and/or timing synchronism can introduce a significant deviation in the dipole-cleaned CMB temperature. After a full-sky observational scan, the accumulated deviations will be structured with a pattern closely correlated with the observation pattern with artificial anisotropies, including artificial quadrupole, octupole, etc., on large scales in the final CMB map. Such scan-induced anisotropies on large scales can be predicted by the true dipole moment and observational scan scheme. Indeed, the expected scan-induced quadrupole pattern of the Wilkinson Microwave Anisotropy Probe (WMAP) mission is perfectly in agreement with the published WMAP quadrupole. With the scan strategy of the Planck mission, we predict that scan-induced anisotropies will also produce an artificially aligned quadrupole. The scan-induced anisotropy is a common problem for all sweep missions and, like the foreground emissions, has to be removed from observed maps. Without doing so, CMB maps from COBE, WMAP, and Planck are not reliable for studying the CMB anisotropy.

Liu Hao; Li Tipei, E-mail: liuhao@ihep.ac.cn, E-mail: litp@tsinghua.edu.cn [Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing (China)

2011-05-10T23:59:59.000Z

366

Applications of CAT scanning for oil and gas production research  

SciTech Connect

Computer Axial Tomography (CAT scanning) is a valuable tool in production research because it provides the ability to nondestructively identify and evaluate the internal structural characteristics of reservoir core material systems. CAT scanning can be applied to obtain either qualitative (visual) or quantitative (numerical) data. Specific applications include core analysis and fluid flow studies. In this paper, the authors' general explanation of the instrumentation and theory is provided along with specific examples of CAT scanning applications to several reservoir core material systems.

Coles, M.E.; Muegge, E.L.; Sprunt, E.S. (Mobil Research and Development Corp., Dallas, TX (United States))

1991-04-01T23:59:59.000Z

367

Los Alamos: MST: MST-6: EML: Electron Microscopy Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) FEI Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) This is a versatile field emission scanning electron microscope integrated with a focused ion beam column that is used for sophisticated SEM and TEM sample preparation, micromachining, and ultrahigh resolution SEM imaging. The microscope is also equipped for x-ray microanalysis and crystallographic orientation imaging. Microscope consists of a Hexalens SFEG electron beam column, and a Magnum ion beam column with a gallium liquid metal ion source. Imaging with both secondary electrons and ions. Digital image acquisition. Small, stable, high brightness Schottky based field emission electron source provides 1.5 nm resolution at 30 kV. Three electron beam lens modes - normal imaging, high resolution imaging, and EDS imaging.

368

NCEM National Center for Electron Microscopy: Microscopes and...  

NLE Websites -- All DOE Office Websites (Extended Search)

The system contains both a focused Ga+ ion beam and a field emission scanning electron column. The ion column can be used for selective removal of material by ion beam...

369

True Along-Track Scan to Improve Radiation Budget Estimations  

Science Conference Proceedings (OSTI)

Multiangle approaches for radiance-to-flux conversion require accurate coregistration between the observations from nadir- and oblique-viewing directions. The along-track mode of Earth Radiation Budget (ERB) scanning instruments, such as the ...

Michel Capderou; Michel Viollier

2006-08-01T23:59:59.000Z

370

Achieving sub-10-nm resolution using scanning electron beam lithography  

E-Print Network (OSTI)

Achieving the highest possible resolution using scanning-electron-beam lithography (SEBL) has become an increasingly urgent problem in recent years, as advances in various nanotechnology applications have driven demand for ...

Cord, Bryan M. (Bryan Michael), 1980-

2009-01-01T23:59:59.000Z

371

Simulation and characterization of a miniaturized Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

A miniaturized Scanning Electron Microscope (mini-SEM) for in-situ lunar investigations is being developed at NASA Marshall Space Flight Center with colleagues from the University of Alabama in Huntsville (UAH), Advanced Research Systems (ARS), and the ...

Jessica. A. Gaskin; Gregory A. Jerman; Stephanie Medley; Don Gregory; Terry O. Abbott; Allen R. Sampson

2011-03-01T23:59:59.000Z

372

Genome scanning : an AFM-based DNA sequencing technique  

E-Print Network (OSTI)

Genome Scanning is a powerful new technique for DNA sequencing. The method presented in this thesis uses an atomic force microscope with a functionalized cantilever tip to sequence single stranded DNA immobilized to a mica ...

Elmouelhi, Ahmed (Ahmed M.), 1979-

2003-01-01T23:59:59.000Z

373

Development of a microfluidic device for patterning multiple species by scanning probe lithography  

E-Print Network (OSTI)

Scanning Probe Lithography (SPL) is a versatile nanofabrication platform that leverages microfluidic “ink” delivery systems with Scanning Probe Microscopy (SPM) for generating surface-patterned chemical functionality on the sub-100 nm length scale. One of the prolific SPL techniques is Dip Pen Nanolithography™ (DPN™). High resolution, multiplexed registration and parallel direct-write capabilities make DPN (and other SPL techniques) a power tool for applications that are envisioned in micro/nano-electronics, molecular electronics, catalysis, cryptography (brand protection), combinatorial synthesis (nano-materials discovery and characterization), biological recognition, genomics, and proteomics. One of the greatest challenges for the successful performance of the DPN process is the delivery of multiple inks to the scanning probe tips for nano-patterning. The purpose of the present work is to fabricate a microfluidic ink delivery device (called “Centiwell”) for DPN (and other SPL) applications. The device described in this study maximizes the number of chemical species (inks) for nanofabrication that can be patterned simultaneously by DPN to conform the industrial standards for fluid handling for biochemical assays (e.g., genomic and proteomic). Alternate applications of Centiwell are also feasible for the various envisioned applications of DPN (and other SPL techniques) that were listed above. The Centiwell consists of a two-dimensional array of 96 microwells that are bulk micromachined on a silicon substrate. A thermoelectric module is attached to the back side of the silicon substrate and is used to cool the silicon substrate to temperatures below the dew point. By reducing the temperature of the substrate to below the dew point, water droplets are condensed in the microwell array. Microbeads of a hygroscopic material (e.g., poly-ethylene glycol) are dispensed into the microwells to prevent evaporation of the condensed water. Furthermore, since poly-ethylene glycol (PEG) is water soluble, it forms a solution inside the microwells which is subsequently used as the ink for the DPN process. The delivery of the ink to the scanning probe tip is performed by dipping the tip (or multiple tips in an array) into the microwells containing the PEG solution. This thesis describes the various development steps for the Centiwell. These steps include the mask design, the bulk micromachining processes explored for the micro-fabrication of the microwell array, the thermal design calculations performed for the selection of the commercially available thermoelectric coolers, the techniques explored for the synthesis of the PEG microbeads, and the assembly of all the components for integration into a functional Centiwell. Finally, the successful implementation of the Centiwell for nanolithography of PEG solutions is also demonstrated.

Rivas Cardona, Juan Alberto

2006-08-01T23:59:59.000Z

374

A novel random access scan flip-flop design  

E-Print Network (OSTI)

Serial scan design causes unnecessary switching activity during testing causing enormous power dissipation. The test time increases enormously with the increase in number of flip-flops. An alternate to serial scan architecture is Random Access Scan (RAS). Here every flip-flop is uniquely addressed using an address decoder. Although it may seem to have solved most of the current problems associated with testing integrated circuits, yet one may impulsively conclude that the routing and area overhead associated with RAS is prohibitive. We present a design of the RAS flip-flop which uses a unique “toggle” mechanism, possible only in RAS. We minimize the number of gates (transistors) and eliminate the need for two globally routed (scan in and test control) signals present in earlier designs. Our design is built keeping in focus the address decoder complexity to a bare minimum. Our multistage scan-out system enables the addressed flip-flop to be observed without compromising performance due to a slow output bus. We have estimated the additional gates required to implement RAS over serial scan (SS). The design obtained equal fault coverage, 60 % test vector reduction and 99 % lesser power dissipation as compared to SS. 1.

S. Mudlapur; Vishwani D. Agrawal; Adit D. Singh

2005-01-01T23:59:59.000Z

375

Swept source optical coherence microscopy for pathological assessment of cancerous tissues  

E-Print Network (OSTI)

Optical coherence microscopy (OCM) combines optical coherence tomography (OCT) with confocal microscopy and enables depth resolved visualization of biological specimens with cellular resolution. OCM offers a suitable ...

Ahsen, Osman Oguz

2013-01-01T23:59:59.000Z

376

A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture  

Science Conference Proceedings (OSTI)

In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any specific clock tree construction, special scan cells, or scan chain reordering. Test ... Keywords: ATPG, peak current reduction, average power dissipation, scan designs, clock tree construction, special scan cells, scan chain reordering

Seongmoon Wang; Wenlong Wei

2007-01-01T23:59:59.000Z

377

Variable temperature electrochemical strain microscopy of Sm-doped ceria  

Science Conference Proceedings (OSTI)

Variable temperature electrochemical strain microscopy has been used to study the electrochemical activity of Sm-doped ceria as a function of temperature and bias. The electrochemical strain microscopy hysteresis loops have been collected across the surface at different temperatures and the relative activity at different temperatures has been compared. The relaxation behavior of the signal at different temperatures has been also evaluated to relate kinetic process during bias induced electrochemical reactions with temperature and two different kinetic regimes have been identified. The strongly non-monotonic dependence of relaxation behavior on temperature is interpreted as evidence for water-mediated mechanisms.

Jesse, Stephen [ORNL; Morozovska, A. N. [National Academy of Science of Ukraine, Kiev, Ukraine; Kalinin, Sergei V [ORNL; Eliseev, E. A. [National Academy of Science of Ukraine, Kiev, Ukraine; Yang, Nan [ORNL; Doria, Sandra [ORNL; Tebano, Antonello [ORNL

2013-01-01T23:59:59.000Z

378

Application of hydrogenation to low-temperature cleaning of the Si(001) surface in the processes of molecular-beam epitaxy: Investigation by scanning tunneling microscopy, reflected high-energy electron diffraction, and high resolution transmission electron microscopy  

Science Conference Proceedings (OSTI)

Structural properties of the clean Si(001) surface obtained as a result of low-temperature (470-650 Degree-Sign C) pre-growth annealings of silicon wafers in a molecular-beam epitaxy chamber have been investigated. To decrease the cleaning temperature, a silicon surface was hydrogenated in the process of a preliminary chemical treatment in HF and NH{sub 4}F aqueous solutions. It has been shown that smooth surfaces composed of wide terraces separated by monoatomic steps can be obtained by dehydrogenation at the temperatures Greater-Than-Or-Equivalent-To 600 Degree-Sign C, whereas clean surfaces obtained at the temperatures clean surfaces on the temperature of hydrogen thermal desorption and the process of the preliminary chemical treatment. The frequency of detachment/attachment of Si dimers from/to the steps and effect of the Ehrlich-Schwoebel barrier on ad-dimer migration across steps have been found to be the most probable factors determining a degree of the resultant surface roughness.

Arapkina, L. V.; Krylova, L. A.; Chizh, K. V.; Chapnin, V. A.; Uvarov, O. V.; Yuryev, V. A. [A. M. Prokhorov General Physics Institute of the Russian Academy of Sciences, 38 Vavilov Street, Moscow 119991 (Russian Federation)

2012-07-01T23:59:59.000Z

379

Volume Scanning Strategies for 3D Wind Retrieval from Dual-Doppler Lidar Measurements  

Science Conference Proceedings (OSTI)

Dual-Doppler lidar volume scans for 3D wind retrieval must accommodate the conflicting goals of dense spatial coverage and short scan duration. In this work, various scanning strategies are evaluated with semisynthetic wind fields from analytical ...

Susanne Drechsel; Georg J. Mayr; Michel Chong; Fotini K. Chow

2010-11-01T23:59:59.000Z

380

Phase Contrast Microscopy with Soft and Hard X-rays  

E-Print Network (OSTI)

Calibration ­ Uses up part of dynamic range · Solution: ­ Soft x-rays: Back side Illumination ­ Hard xPhase Contrast Microscopy with Soft and Hard X-rays Using a Segmented Detector Benjamin Hornberger ­ Phase Contrast 101 · A Segmented Detector for Hard X-ray Microprobes ­ Segmented Silicon Chip ­ Charge

Homes, Christopher C.

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


381

PARALLEL ION BEAM PROFILE SCAN USING LASER WIRE  

Science Conference Proceedings (OSTI)

We report on the world s first experiment of a parallel profile scan of the hydrogen ion (H-) beam using a laser wire system. The system was developed at the superconducting linac of the Spallation Neutron Source (SNS) accelerator complex. The laser wire profile scanner is based on a photo-detachment process and therefore can be conducted on an operational H- beam in a nonintrusive manner. The parallel profile scanning system makes it possible to simultaneously measure profiles of the 1-MW neutron production H- beam at 9 different locations of the linac by using a single light source. This paper describes the design, optical system and software platform development, and measurement results of the parallel profile scanning system.

Liu, Yun [ORNL; Aleksandrov, Alexander V [ORNL; Huang, Chunning [ORNL; Long, Cary D [ORNL; Dickson, Richard W [ORNL

2013-01-01T23:59:59.000Z

382

Composition analysis by scanning femtosecond laser ultraprobing (CASFLU).  

DOE Patents (OSTI)

The composition analysis by scanning femtosecond ultraprobing (CASFLU) technology scans a focused train of extremely short-duration, very intense laser pulses across a sample. The partially-ionized plasma ablated by each pulse is spectrometrically analyzed in real time, determining the ablated material's composition. The steering of the scanned beam thus is computer directed to either continue ablative material-removal at the same site or to successively remove nearby material for the same type of composition analysis. This invention has utility in high-speed chemical-elemental, molecular-fragment and isotopic analyses of the microstructure composition of complex objects, e.g., the oxygen isotopic compositions of large populations of single osteons in bone.

Ishikawa, Muriel Y. (Livermore, CA); Wood, Lowell L. (Simi Valley, CA); Campbell, E. Michael (Danveille, CA); Stuart, Brent C. (Livermore, CA); Perry, Michael D. (Livermore, CA)

2002-01-01T23:59:59.000Z

383

Influence of Surface Preparation on Scanning Kelvin Probe Microscopy and Electron Backscatter Diffraction Analysis of Cross Sections of CdTe/CdS Solar Cells: Preprint  

DOE Green Energy (OSTI)

In this work we investigated different methods to prepare cross sections of CdTe/CdS solar cells for EBSD and SKPM analyses. We observed that procedures used to prepare surfaces for EBSD are not suitable to prepare cross sections, and we were able to develop a process using polishing and ion-beam milling. This process resulted in very good results and allowed us to reveal important aspects of the cross section of the CdTe film. For SKPM, polishing and a light ion-beam milling resulted in cross sections that provided good data. We were able to observe the depletion region on the CdTe film and the p-n junction as well as the interdiffusion layer between CdTe and CdS. However, preparing good-quality cross sections for SKPM is not a reproducible process, and artifacts are often observed.

Moutinho, H. R.; Dhere, R. G.; Jiang, C. S.; Al-Jassim, M. M.

2011-06-01T23:59:59.000Z

384

Atomic-Scale Investigation of Epitaxial Graphene Grown on 6H-SiC(0001) Using Scanning Tunneling Microscopy and Spectroscopy  

E-Print Network (OSTI)

. Typically, the atomic structures of the graphene were resolved at sample bias voltages below 0.5 V graphene continuously extended across four SiC bilayers, as confirmed by the line profile. A height .) 13346 J. Phys. Chem. C, Vol. 114, No. 31, 2010 Choi et al. #12;shaped protrusions at high bias voltage

Kim, Sehun

385

Scanning gate microscopy on graphene: charge inhomogeneity and extrinsic doping This article has been downloaded from IOPscience. Please scroll down to see the full text article.  

E-Print Network (OSTI)

mode tip and local top gate. Electrical transport through graphene at various back gate voltages is monitored as a function of tip voltage and tip position. Near the Dirac point, the response of graphene, USA. graphene field effect transistor (GFET), a voltage applied to a gate (capacitively coupled

Chen, Yong P.

386

Atomic scale investigations of the thermal and electron induced chemistry of small molecules on platinum(111) as revealed by scanning tunneling microscopy  

Science Conference Proceedings (OSTI)

The work presented here can be divided into two parts: 1) an experimental and analysis section dealing with the investigation of small molecules such as methyl bromide, carbon dioxide, diatomic nitrogen, methane and methane?s photochemical derivative methyl radical adsorbed onto the Pt(111) surface, and 2) A detailed explanation of the current STM and chamber, with included designs and detailed instructions for operation and maintenance of both the STM and chamber. The investigations of the methyl bromide molecule show interesting dipole-dipole interactions on the Pt(111) surface. With a (6 x 3) lattice being described as the full monolayer that was created by overdosing and annealing to 104 K. The (6 x 3) lattice is shown to occupy top sites and three fold hollow sites on the Pt(111) surface giving rise to a very sharp and symmetrically split ?2 RAIRS mode, and the absence of the ?5 mode in RAIRS is indicative that the molecules are all aligned with their C-Br bond parallel to the surface normal. Additional sub-monolayer structures were observed that had components that were not aligned with the surface normal. The submonolayer lattices ranging from a structured 0.12 ML to a random coverages estimated at 0.20 ML, to a shift in the (6 x 3) lattice resulting in a high local line coverage of 0.33 ML. Analysis of the CO2 molecules adsorbed onto the Pt(111) surface shows that there is a preferred high temperature dosing that results in a thermodynamically stable system of a (3 x 3) lattice consisting of both horizontal and vertical molecules. The coverage of the (3 x 3) lattice of vertical molecules is 0.11 ML which can be assigned to the RAIRS peak of 2287 cm-1. The vertical molecules are seen to occupy the hollow sites within the horizontal (3 x 3) lattice. The low temperature dosage of multilayers and annealing, to 78 K, show that the (3 x 3) lattice is compressed into a lattice of (5 x 3) with some of the molecules in the unit cell that are incommensurate with the Pt(111) lattice. However, isolated unit cells of the horizontal (3 x 3) lattices remain after the compression which allows a single vertical CO2 molecule to occupy the hollow site resulting in the characteristic 2277 cm-1 peak in RAIRS. The resulting local coverage of the (5 x 3) lattice is calculated to be 0.40 ML. Methane was found to adsorb onto the Pt(111) lattice in a (?3 x ?3) configuration yielding a coverage of 0.33 ML in perfect agreement with previous coverage assignments. With a full coverage of methane adsorbed onto the crystal surface an ArF excimer laser was used to photodissociate the molecules to create methyl radicals that could be imaged by STM. After photochemical deposition of methyl radicals and annealing the surface to 175 K, the STM was used to image the surface. The methyl radical were estimated to arrange in a (?3 by ?3) lattice same as the methane, and imaged as roughly 0.4 ? high protrusions from the surface with a diameter of 5.5 ?. The last molecule that was studied, was the adsorption of diatomic nitrogen on the Pt(111) surface at a temperature of 25 K. Due to the very low desorption temperature of N2 (i.e. 46 K) and the relatively high temperature of the crystal, only chemisorbed molecules were able to be resolved. The results confirm that diatomic nitrogen binds to the top side of the Pt(111) step edge in agreement with Yates RAIRS studies, and calculations by Norskov. However, there was observed a stable cluster of molecules bound to the lower side of the step edge in a (2 x 2) lattice configuration which has previously unknown before these images and is the most likely source of the photoactivity of nitrogen molecules on the crystal surface. It is the hopes of this author that the experiments described within the dissertation lead to new and better understanding of the role that the microscopic scale structures of adsorbates on the surface play in catalysis. Also that the general information of STM design, construction and tip fabrication will be useful to all students who follow me in working

Schwendemann, Todd Charles

2006-01-01T23:59:59.000Z

387

Measuring the effects of low energy ion milling on the magnetization of Co/Pd multilayers using scanning electron microscopy with polarization analysis  

E-Print Network (OSTI)

effects of low energy ion milling on the magnetization ofchange caused by the milling. In conclusion, we demonstratednm?, on the energy of ion milling is investigated using

2010-01-01T23:59:59.000Z

388

Investigation of the ligand shells of homo-ligand and mixed-ligand monolayer protected metal nanoparticles : a scanning tunneling microscopy study  

E-Print Network (OSTI)

Monolayer Protected Metal Nanoparticles have recently found widespread use in and are the focus of intensive study in many areas of scientific research ranging from biology to physics to medicine. Consisting of a nanoscale, ...

Jackson, Alicia M

2007-01-01T23:59:59.000Z

389

Investigating the relationship between the superconducting and pseudogap states of the high-temperature superconductor Bi-2201 using scanning tunneling microscopy  

E-Print Network (OSTI)

There is considerable controversy regarding the nature of the relationship between the superconducting and pseudogap states of high-temperature superconductors. Although there exist a large number of theories regarding ...

Boyer, Michael Christopher

2008-01-01T23:59:59.000Z

390

Atomic scale investigations of the thermal and electron induced chemistry of small molecules on platinum(111) as revealed by scanning tunneling microscopy  

SciTech Connect

The work presented here can be divided into two parts: 1) an experimental and analysis section dealing with the investigation of small molecules such as methyl bromide, carbon dioxide, diatomic nitrogen, methane and methane?s photochemical derivative methyl radical adsorbed onto the Pt(111) surface, and 2) A detailed explanation of the current STM and chamber, with included designs and detailed instructions for operation and maintenance of both the STM and chamber. The investigations of the methyl bromide molecule show interesting dipole-dipole interactions on the Pt(111) surface. With a (6 x 3) lattice being described as the full monolayer that was created by overdosing and annealing to 104 K. The (6 x 3) lattice is shown to occupy top sites and three fold hollow sites on the Pt(111) surface giving rise to a very sharp and symmetrically split ?2 RAIRS mode, and the absence of the ?5 mode in RAIRS is indicative that the molecules are all aligned with their C-Br bond parallel to the surface normal. Additional sub-monolayer structures were observed that had components that were not aligned with the surface normal. The submonolayer lattices ranging from a structured 0.12 ML to a random coverages estimated at 0.20 ML, to a shift in the (6 x 3) lattice resulting in a high local line coverage of 0.33 ML. Analysis of the CO2 molecules adsorbed onto the Pt(111) surface shows that there is a preferred high temperature dosing that results in a thermodynamically stable system of a (3 x 3) lattice consisting of both horizontal and vertical molecules. The coverage of the (3 x 3) lattice of vertical molecules is 0.11 ML which can be assigned to the RAIRS peak of 2287 cm-1. The vertical molecules are seen to occupy the hollow sites within the horizontal (3 x 3) lattice. The low temperature dosage of multilayers and annealing, to 78 K, show that the (3 x 3) lattice is compressed into a lattice of (5 x 3) with some of the molecules in the unit cell that are incommensurate with the Pt(111) lattice. However, isolated unit cells of the horizontal (3 x 3) lattices remain after the compression which allows a single vertical CO2 molecule to occupy the hollow site resulting in the characteristic 2277 cm-1 peak in RAIRS. The resulting local coverage of the (5 x 3) lattice is calculated to be 0.40 ML. Methane was found to adsorb onto the Pt(111) lattice in a (?3 x ?3) configuration yielding a coverage of 0.33 ML in perfect agreement with previous coverage assignments. With a full coverage of methane adsorbed onto the crystal surface an ArF excimer laser was used to photodissociate the molecules to create methyl radicals that could be imaged by STM. After photochemical deposition of methyl radicals and annealing the surface to 175 K, the STM was used to image the surface. The methyl radical were estimated to arrange in a (?3 by ?3) lattice same as the methane, and imaged as roughly 0.4 ? high protrusions from the surface with a diameter of 5.5 ?. The last molecule that was studied, was the adsorption of diatomic nitrogen on the Pt(111) surface at a temperature of 25 K. Due to the very low desorption temperature of N2 (i.e. 46 K) and the relatively high temperature of the crystal, only chemisorbed molecules were able to be resolved. The results confirm that diatomic nitrogen binds to the top side of the Pt(111) step edge in agreement with Yates RAIRS studies, and calculations by Norskov. However, there was observed a stable cluster of molecules bound to the lower side of the step edge in a (2 x 2) lattice configuration which has previously unknown before these images and is the most likely source of the photoactivity of nitrogen molecules on the crystal surface. It is the hopes of this author that the experiments described within the dissertation lead to new and better understanding of the role that the microscopic scale structures of adsorbates on the surface play in catalysis. Also that the general information of STM design, construction and tip fabrication will be useful to all students who follow me in working

Schwendemann, Todd Charles

2006-01-01T23:59:59.000Z

391

Submicrometre-Resolution Polychromatic Three-dimensional X-ray Microscopy  

Science Conference Proceedings (OSTI)

The ability to study the structure, microstructure and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic three-dimensional X-ray microscopy (3DXM) is a recently developed nondestructive diffraction technique that enables crystallographic phase identification, determination of local crystal orientations, grain morphologies, grain interface types and orientations, and in favorable cases direct determination of the deviatoric elastic strain tensor with submicrometre spatial resolution in all three dimensions. With the added capability of an energy-scanning incident beam monochromator, the determination of absolute lattice parameters is enabled, allowing specification of the complete elastic strain tensor with three- dimensional spatial resolution. The methods associated with 3DXM are described and key applications of 3DXM are discussed, including studies of deformation in single-crystal and polycrystalline metals and semiconductors, indentation deformation, thermal grain growth in polycrystalline aluminium, the metal insulator transition in nanoplatelet VO 2 , interface strengths in metal matrix composites, high-pressure science, Sn whisker growth, and electromigra- tion processes. Finally, the outlook for future developments associated with this technique is described.

Larson, Ben C [ORNL; Levine, Lyle E. [National Institute of Standards and Technology (NIST)

2013-01-01T23:59:59.000Z

392

Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy  

SciTech Connect

Strain engineering in the conduction channel is a cost effective method of boosting the performance in state-of-the-art semiconductor devices. However, given the small dimensions of these devices, it is difficult to quantitatively measure the strain with the required spatial resolution. Three different transmission electron microscopy techniques, high-angle annular dark field scanning transmission electron microscopy, dark field electron holography, and nanobeam electron diffraction have been applied to measure the strain in simple bulk and SOI calibration specimens. These techniques are then applied to different gate length SiGe SOI pFET devices in order to measure the strain in the conduction channel. For these devices, improved spatial resolution is required, and strain maps with spatial resolutions as good as 1 nm have been achieved. Finally, we discuss the relative advantages and disadvantages of using these three different techniques when used for strain measurement.

Cooper, David; Denneulin, Thibaud; Barnes, Jean-Paul; Hartmann, Jean-Michel; Hutin, Louis; Le Royer, Cyrille [CEA, LETI France MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Beche, Armand [CEA, LETI, and FEI France MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Rouviere, Jean-Luc [CEA, INAC, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France)

2012-12-15T23:59:59.000Z

393

A Scanning Frequency Mode for Ion Cyclotron Mobility Spectrometry  

E-Print Network (OSTI)

A new operational mode for an ion cyclotron mobility spectrometry instrument is explored as a possibleA Scanning Frequency Mode for Ion Cyclotron Mobility Spectrometry Rebecca S. Glaskin, Stephen J that are applied to segmented regions of a circular drift tube. Ions with mobilities that are resonant

Clemmer, David E.

394

A 35-GHz Scanning Doppler Radar for Fog Observations  

Science Conference Proceedings (OSTI)

To observe fog, a 35-GHz scanning Doppler radar was designed, assembled, and tested. The radar, mounted on a flatbed vehicle for portability, transmits peak powers of 100 kW in a pulse of 0.5-µs width and a beamwidth of 0.3°. Thus, a reflectivity ...

Kyosuke Hamazu; Hiroyuki Hashiguchi; Toshio Wakayama; Tomoya Matsuda; Richard J. Doviak; Shoichiro Fukao

2003-07-01T23:59:59.000Z

395

Scanning multichannel microwave radiometer snow water equivalent assimilation  

E-Print Network (OSTI)

climatic driver through the surface albedo's role in energy and water budgets [e.g., Yeh et al., 1983Scanning multichannel microwave radiometer snow water equivalent assimilation Jiarui Dong,1 due to complicating effects, including distance to open water, presence of wet snow, and presence

Houser, Paul R.

396

Large energy-spread beam diagnostics through quadrupole scans  

Science Conference Proceedings (OSTI)

The Facility for Advanced Accelerator and Experimental Tests (FACET) is a new user facility at the SLAC National Accelerator Laboratory, servicing next-generation accelerator experiments. The 1.5% RMS energy spread of the FACET beam causes large chromatic aberrations in optics. These aberrations necessitate updated quadrupole scan fits to remain accurate.

Frederico, Joel; Adli, Erik; Hogan, Mark; Raubenheimer, Tor [SLAC National Accelerator Laboratory (United States)

2012-12-21T23:59:59.000Z

397

100% container scanning : security policy implications for global supply chains  

E-Print Network (OSTI)

On August 3, 2007, President George Bush signed into law HR1 the "Implementing Recommendations of the 9/11 Commission Act of 2007." The 9/11 Act requires 100% scanning of US-bound containers at foreign seaports by 2012 ...

Bennett, Allison C. (Allison Christine)

2008-01-01T23:59:59.000Z

398

Synthesis and characterization of carbon nanotubes using scanning probe based nano-lithographic techniques  

E-Print Network (OSTI)

A novel process which does not require the traditional Chemical Vapor Deposition (CVD) synthesis techniques and which works at temperatures lower than the conventional techniques was developed for synthesis of carbon nanotubes (CNT). The substrates used for this study involved MEMS (Micro Electrical Mechanical Systems) elements and passive elements. These were coated with Fullerene using Physical Vapor Deposition or through a solution in an organic solvent. Catalyst precursors were deposited on these Fullerene coated substrates using “wet processes”. These substrates were then heated using either the integrated microheaters or external heaters in an inert atmosphere to obtain CNT. Thus, in this process we tried to obviate the Chemical Vapor Deposition (CVD) process for synthesis of CNT (SWCNT and MWCNT). The synthesized CNT will be characterized using Scanning Electron Microscopy and Raman spectroscopy techniques. Also, conductivity measurements were carried out for the synthesized tubes using Dry (contact based) and Wet (electro-chemical) methods. This work also proves the concept for the feasibility for a portable hand held instrument for synthesis of CNT with tunable “on demand” chirality.

Gargate, Rohit Vasant

2008-12-01T23:59:59.000Z

399

Thin-section microscopy of decayed crystalline marble from the garden sculptures of Schoenbrunn Palace in Vienna  

SciTech Connect

Sterzing marble, a crystalline white marble used in the late-Baroque garden sculptures of Schoenbrunn Palace in Vienna, was studied by means of thin-section and scanning electron microscopy in order to obtain a better understanding of its surface decay caused by atmospheric weathering. Following the classification of distinct phenomena of deterioration by visual on-site inspection, the microstructural features including surface erosion, micro-cracking, soiling, black crust formation, and microbiological infestation are exemplified by microscopical images and are briefly discussed. The results proved useful for evaluating and understanding the various types of marble decay for creating a safer basis for establishing the procedural principles aimed at conservation and maintenance of the sculptures.

Weber, J. [Institute of Art and Technology, Conservation Sciences, University of Applied Arts Vienna. A-1013 Vienna, Salzgries 14/1 (Austria)], E-mail: johannes.weber@uni-ak.ac.at; Beseler, S. [Institute of Conservation and Restoration, University of Applied Arts Vienna A-1013 Vienna, Salzgries 14/4 (Austria); Sterflinger, K. [Institute for Applied Microbiology, Department of Biotechnology, University of Natural Resources and Applied Life Sciences, Vienna A-1190 Vienna, Muthgasse 18 (Austria)

2007-11-15T23:59:59.000Z

400

NCEM National Center for Electron Microscopy: About NCEM  

NLE Websites -- All DOE Office Websites (Extended Search)

NCEM NCEM The National Center for Electron Microscopy (NCEM) is one of the world's foremost centers for electron microscopy and microcharacterization. It is an Office of Science User Facility operated for the U.S. Department of Energy by Lawrence Berkeley National Laboratory. Located adjacent to the University of California, Berkeley, NCEM was established in 1983 to maintain a forefront research center for electron-optical characterization of materials with state-of-the-art instrumentation and expertise. As a national user facility, NCEM is open to scientists from universities, government and industrial laboratories. The center provides cutting-edge instrumentation, techniques and expertise for advanced electron beam microcharacterization of materials at high spatial

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


401

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

402

X-Ray Diffraction Microscopy of Magnetic Structures  

NLE Websites -- All DOE Office Websites (Extended Search)

X-Ray Diffraction Microscopy of Magnetic Structures Print X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the electron density of complicated molecules. The formula used to make these calculations contains terms that relate to the electron spin of magnetic atoms, but these terms are traditionally ignored since coherent x-ray diffraction has not been used to retrieve magnetic information. Using the full formula allows for the determination of not only the electron density, but also the magnetic spin distribution and its orientation.

403

Exploring nanomagnetism with soft x-ray microscopy  

SciTech Connect

Magnetic soft X-ray microscopy images magnetism in nanoscale systems with a spatial resolution down to 15nm provided by state-of-the-art Fresnel zone plate optics. X-ray magnetic circular dichroism (X-MCD) is used as element-specific magnetic contrast mechanism similar to photoemission electron microscopy (PEEM), however, with volume sensitivity and the ability to record the images in varying applied magnetic fields which allows to study magnetization reversal processes at fundamental length scales. Utilizing a stroboscopic pump-probe scheme one can investigate fast spin dynamics with a time resolution down to 70 ps which gives access to precessional and relaxation phenomena as well as spin torque driven domain wall dynamics in nanoscale systems. Current developments in zone plate optics aim for a spatial resolution towards 10nm and at next generation X-ray sources a time resolution in the fsec regime can be envisioned.

Fischer, P.; Kim, D.-H.; Mesler, B.L.; Chao, W.; Sakdinawat,A.E.; Anderson, E.H.

2006-10-30T23:59:59.000Z

404

X-ray Microscopy and Imaging (XSD-XMI)  

NLE Websites -- All DOE Office Websites (Extended Search)

Imaging (XMI) Imaging (XMI) About XMI Science and Research Beamlines Highlights Software and Tools Intranet Search APS... Argonne Home > Advanced Photon Source > Contacts FAQs Beamlines News Publications APS Email Portal APS Intranet APS Phonebook APS Quick Links for Users APS Safety and Training Welcome to the X-ray Microscopy and Imaging group (XMI)! X-ray Microscopy and Imaging is part of the X-ray Science Division at the Advanced Photon Source. We develop and support a diverse and multidisciplinary user research program at Sectors 2 and 32 of the APS, with the overall goal to image and study materials structures at spatial and temporal resolutions that are most scientifically relevant to the cutting-edge advances in materials, biological, environmental, and biomedical sciences. To achieve this goal, we actively engage in various research activities including

405

X-Ray Diffraction Microscopy of Magnetic Structures  

NLE Websites -- All DOE Office Websites (Extended Search)

X-Ray Diffraction Microscopy of Magnetic Structures Print X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the electron density of complicated molecules. The formula used to make these calculations contains terms that relate to the electron spin of magnetic atoms, but these terms are traditionally ignored since coherent x-ray diffraction has not been used to retrieve magnetic information. Using the full formula allows for the determination of not only the electron density, but also the magnetic spin distribution and its orientation.

406

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

407

CFN Operations and Safety Awareness (COSA) Checklist Electron Microscopy Facility  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Facility Electron Microscopy Facility Building 735 This COSA form must be completed for all experimenters working in the CFN and must be submitted to the CFN User Office for badge access. CFN Safety Awareness Policy: Each user must be instructed in the safe procedures in CFN related activities. CFN Facility Laboratory personnel shall keep readily available all relevant instructions and safety literature. Employee/Guest Name Life/Guest Number Department/Division ES&H Coordinator/Ext. Facility Manager COSA Trainer Guest User Staff USER ADMINISTRATION Checked in at User Administration and has valid BNL ID badge Safety Approval Form (SAF) approved. Training requirements completed (Indicate additional training specified in SAF or ESR in lines provided below):

408

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

409

X-Ray Diffraction Microscopy of Magnetic Structures  

NLE Websites -- All DOE Office Websites (Extended Search)

X-Ray Diffraction Microscopy of Magnetic Structures Print X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the electron density of complicated molecules. The formula used to make these calculations contains terms that relate to the electron spin of magnetic atoms, but these terms are traditionally ignored since coherent x-ray diffraction has not been used to retrieve magnetic information. Using the full formula allows for the determination of not only the electron density, but also the magnetic spin distribution and its orientation.

410

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Diffraction Microscopy Print Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

411

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

0.5 0.5 The TEAM 0.5 microscope is a double-aberration-corrected (scanning) transmission electron microscope (STEM/TEM) capable of producing images with 50 pm resolution. The basic instrument is a modified FEI Titan 80-300 microscope equipped with a special high-brightness Schottky-field emission electron source, a gun monochromator, a high-resolution GIF Tridiem energy-filter, and two CEOS hexapole-type spherical aberration correctors. The illumination aberration corrector corrects coherent axial aberrations up to 4th order, as well as 5th order spherical aberration and six-fold astigmatism. The imaging aberration corrector fully corrects for coherent axial aberrations up to 3rd order and partially compensates for 4th and 5th order aberrations. The microscope has two 2048x2048 slow-scan CCD

412

Computer-intensive rate estimation, diverging statistics and scanning  

E-Print Network (OSTI)

A general rate estimation method is proposed that is based on studying the in-sample evolution of appropriately chosen diverging/converging statistics. The proposed rate estimators are based on simple least squares arguments, and are shown to be accurate in a very general setting without requiring the choice of a tuning parameter. The notion of scanning is introduced with the purpose of extracting useful subsamples of the data series; the proposed rate estimation method is applied to different scans, and the resulting estimators are then combined to improve accuracy. Applications to heavy tail index estimation as well as to the problem of estimating the long memory parameter are discussed; a small simulation study complements our theoretical results.

McElroy, Tucker

2007-01-01T23:59:59.000Z

413

Measurement of Semiconductor Surface Potential using the Scanning Electron Microscope  

SciTech Connect

We calibrate the secondary electron signal from a standard scanning electron microscope to voltage, yielding an image of the surface or near-surface potential. Data on both atomically abrupt heterojunction GaInP/GaAs and diffused homojunction Si solar cell devices clearly show the expected variation in potential with position and applied bias, giving depletion widths and locating metallurgical junctions to an accuracy better than 10 nm. In some images, distortion near the p-n junction is observed, seemingly consistent with the effects of lateral electric fields (patch fields). Reducing the tube bias removes this distortion. This approach results in rapid and straightforward collection of near-surface potential data using a standard scanning electron microscope.

Heath, J. T.; Jiang, C. S.; Al-Jassim, M. M.

2012-02-15T23:59:59.000Z

414

PHENIX Experiment Results from the RHIC Beam Energy Scan Program  

E-Print Network (OSTI)

The PHENIX Experiment at RHIC has conducted a beam energy scan at several collision energies in order to search for signatures of the QCD critical point and the onset of deconfinement. PHENIX has conducted measurements of transverse energy production, muliplicity fluctuations, the skewness and kurtosis of net charge distributions, Hanbury-Brown Twiss correlations, charged hadron flow, and energy loss. The data analyzed to date show no significant indications of the presence of the critical point.

J. T. Mitchell for the PHENIX Collaboration

2013-08-09T23:59:59.000Z

415

PHENIX Experiment Results from the RHIC Beam Energy Scan Program  

E-Print Network (OSTI)

The PHENIX Experiment at RHIC has conducted a beam energy scan at several collision energies in order to search for signatures of the QCD critical point and the onset of deconfinement. PHENIX has conducted measurements of transverse energy production, muliplicity fluctuations, the skewness and kurtosis of net charge distributions, Hanbury-Brown Twiss correlations, charged hadron flow, and energy loss. The data analyzed to date show no significant indications of the presence of the critical point.

,

2013-01-01T23:59:59.000Z

416

Nanoprobes for Future Generations of Photovoltaics  

DOE Green Energy (OSTI)

In this Solar Program Review Meeting, we report on our most recent progress in scanning probe microscopy (SPM) and its application to photovoltaics. We have developed an SPM to be operated in combination with a scanning electron microscope (SEM) JEOL5800. The SPM platform is compatible with a helium closed-circuit cryostat and fully accessible to the optics of the cathodoluminescence (CL) detectors with which the JEOL5800 is equipped. Among the innovative modes of operation that the combination --and synergy-- of SPM and electron microscopy provides, we describe (i) measurements of the lateral electron transport based on scanning tunneling microscopy (STM) and atomic force microscopy (AFM); (ii) scanning tunneling luminescence (STL); (iii) electroluminescence mapping; and (iv) near-field cathodoluminescence.

Romero, M. J.; Jiang, C.-S.; Moutinho, H. R.; Al-Jassim, M. M.

2005-11-01T23:59:59.000Z

417

Alignment and Aperture Scan at the Fermilab Booster  

Science Conference Proceedings (OSTI)

The Fermilab Booster is currently in the process of an intensity upgrade referred to as the Proton Improvement Plan (PIP). The goal of PIP is to have the Booster provide a proton beam flux of 2 x 10{sup 17} protons/hour. This is almost double the current operation of 1.1 x 10{sup 17} protons/hour. Beam losses in the machine due to the increased flux will create larger integrated doses on aperture limiting components that will need to be mitigated. The Booster accelerates beam from 400 MeV to 8 GeV at a rep rate of 15hz and then extracts beam to the Main Injector. Several percent of the beam is lost within 3 msec after injection in the early part of acceleration. The aperture at injection energy was recently measured using corrector scans. Along with magnet survey data and aperture scan data a plan to realign the magnets in the Booster was developed and implemented in May 2012. The beam studies, analysis of the scan and alignment data, and the result of the magnet moves are presented.

Seiya, K.; Lackey, J.; Marsh, W.; Pellico, W.; Still, D.; Triplet, K.; Waller, A.; /Fermilab

2012-05-01T23:59:59.000Z

418

Sub-Angstrom electron microscopy for sub-Angstrom nano-metrology  

E-Print Network (OSTI)

Microscopy for Sub-Ĺngstrom Nano-Metrology Michael A. O’Microscopy for Sub-Ĺngstrom Nano-Metrology Michael A. O’what we build. Because nano-devices operate on the level of

O'Keefe, Michael A.; Allard, Lawrence F.

2004-01-01T23:59:59.000Z

419

UNIVERSITY OF CALIFORNIA, SANTA CRUZ Life Sciences Microscopy Center Facilities Manager  

E-Print Network (OSTI)

analysis; instrument maintenance and technical support; usage management; maintaining the facility web site or training in a higher-education environment; expertise in both light microscopy and electron microscopy

California at Santa Cruz, University of

420

Electron Microscopy Study of the LiFEPO4 to FePo4 Phase Transition  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Study of the LiFEPO4 to FePo4 Phase Transition Title Electron Microscopy Study of the LiFEPO4 to FePo4 Phase Transition Publication Type Journal Article Year of...

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


421

Wavelength swept spectrally encoded confocal microscopy for biological and clinical applications  

E-Print Network (OSTI)

Spectrally encoded confocal microscopy (SECM) is a technique that facilitates the incorporation of confocal microscopy into small, portable clinical instruments. This would allow in vivo evaluation of cellular and sub-cellular ...

Boudoux, Caroline

2007-01-01T23:59:59.000Z

422

Sixth International Conference on X-ray Microscopy  

SciTech Connect

More than 180 participants from around the world crowded the Clark Kerr Campus of the University of California, Berkeley, from August 1-6, 1999 for the Sixth International Conference on X-Ray Microscopy (XRM99). Held every three years since 1983, the XRM conferences have become the primary international forum for the presentation and discussion of advances in high-spatial-resolution x-ray imaging and applications (including the use of x-ray spectroscopic and analytical techniques) in biological and medical sciences, environmental and soil sciences, and materials and surface sciences.

Robinson, Arthur L.

1999-08-23T23:59:59.000Z

423

Biological Imaging by Soft X-Ray Diffraction Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

Biological Imaging by Soft X-Ray Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations imposed by lens-based optical systems. Researchers from Stony Brook University, in collaboration with scientists at the ALS and Cornell University, have taken a large step in this direction by using a lensless x-ray diffraction microscope to image a freeze-dried yeast cell to better than 30-nm resolution. Images were made at several angular orientations of the cell.

424

Observation of Localized Corrosion of Ni-Based Alloys Using Coupled Orientation Imaging Microscopy and Atomic Force Microscopy  

DOE Green Energy (OSTI)

We present a method for assessing the relative vulnerabilities of distinct classes of grain boundaries to localized corrosion. Orientation imaging microscopy provides a spatial map which identifies and classifies grain boundaries at a metal surface. Once the microstructure of a region of a sample surface has been characterized, a sample can be exposed to repeated cycles of exposure to a corrosive environment alternating with topographic measurement by an atomic force microscope in the same region in which the microstructure had been mapped. When this procedure is applied to Ni and Ni-based alloys, we observe enhanced attack at random grain boundaries relative to special boundaries and twins in a variety of environments.

Bedrossian, P.J.

1999-11-24T23:59:59.000Z

425

Genomics of Electronic Materials  

Science Conference Proceedings (OSTI)

... Metamaterials; Highly correlated electron materials, eg superconductors, such as ... A near-field scanning microwave microscope for characterization ...

2013-08-08T23:59:59.000Z

426

Measurement of Specific Heat Capacity Using Differential Scanning Calorimeter  

SciTech Connect

This document describes the process used at the Idaho National Laboratory’s (INL) High Temperature Test Laboratory (HTTL) for measuring specific heat capacity using a differential scanning calorimeter (DSC). The document is divided into four sections: Approach, in which the technique is described; Setup, in which the physical system is described; Procedure, in which the testing steps are listed and detailed; and Example Test, in which a typical test is outlined following the steps listed in the Procedure section. Example data, results, photos, and curves are provided throughout the document to assist other users of this system.

J. E. Daw

2008-11-01T23:59:59.000Z

427

Visual Scanning Hartmann Optical Tester (VSHOT) Uncertainty Analysis (Milestone Report)  

DOE Green Energy (OSTI)

In 1997, an uncertainty analysis was conducted of the Video Scanning Hartmann Optical Tester (VSHOT). In 2010, we have completed a new analysis, based primarily on the geometric optics of the system, and it shows sensitivities to various design and operational parameters. We discuss sources of error with measuring devices, instrument calibrations, and operator measurements for a parabolic trough mirror panel test. These help to guide the operator in proper setup, and help end-users to understand the data they are provided. We include both the systematic (bias) and random (precision) errors for VSHOT testing and their contributions to the uncertainty. The contributing factors we considered in this study are: target tilt; target face to laser output distance; instrument vertical offset; laser output angle; distance between the tool and the test piece; camera calibration; and laser scanner. These contributing factors were applied to the calculated slope error, focal length, and test article tilt that are generated by the VSHOT data processing. Results show the estimated 2-sigma uncertainty in slope error for a parabolic trough line scan test to be +/-0.2 milliradians; uncertainty in the focal length is +/- 0.1 mm, and the uncertainty in test article tilt is +/- 0.04 milliradians.

Gray, A.; Lewandowski, A.; Wendelin, T.

2010-10-01T23:59:59.000Z

428

Beam energy scan using a viscous hydro+cascade model  

E-Print Network (OSTI)

Following the experimental program at BNL RHIC, we perform a similar "energy scan" using 3+1D viscous hydrodynamics coupled to the UrQMD hadron cascade, and study the collision energy dependence of pion and kaon rapidity distributions and $m_T$-spectra, as well as charged hadron elliptic flow. To this aim the equation of state for finite baryon density from a Chiral model coupled to the Polyakov loop is employed for hydrodynamic stage. 3D initial conditions from UrQMD are used to study gradual deviation from boost-invariant scaling flow. We find that the inclusion of shear viscosity in the hydrodynamic stage of evolution consistently improves the description of the data for Pb-Pb collisions at CERN SPS, as well as of the elliptic flow measurements for Au-Au collisions in the Beam Energy Scan (BES) program at BNL RHIC. The suggested value of shear viscosity is $\\eta/s\\ge0.2$ for $\\sqrt{s_{NN}}=6.3\\dots39$ GeV.

Karpenko, Iu A; Huovinen, P; Petersen, H

2013-01-01T23:59:59.000Z

429

Attitude Determination from a Balloon-Borne Radiometer Using Two-Sided Limb Scanning  

Science Conference Proceedings (OSTI)

The determination of the horizontal attitude of a balloon-borne, infrared, limb-scanning radiometer is discussed. In particular, the relationship between scan-angle, as measured by the instrument, and the tangent height of the ray path through ...

J. R. Drummond; D. Turner; A. Ashton

1986-03-01T23:59:59.000Z

430

Using unlabeled Wi-Fi scan data to discover occupancy patterns of private households  

Science Conference Proceedings (OSTI)

This poster presents the homeset algorithm, a lightweight approach to estimate occupancy schedules of private households. The algorithm relies on the mobile phones of households' occupants to collect Wi-Fi scans. The scans are then used to determine ...

Wilhelm Kleiminger, Christian Beckel, Anind Dey, Silvia Santini

2013-11-01T23:59:59.000Z

431

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

Specimen Preparation Specimen Preparation Preparation of samples with large transparent areas and flat surfaces is a key element of electron microscopy. In particular, the interpretation of lattice or holographic images is often limited by the sample's geometry and surface roughness. These parameters are largely determined by a particular sample preparation procedure. The increasing demand for microscopes with a spatial resolution of better than 1Ă… increases the need for improved sample preparation techniques. A substantial effort at NCEM is devoted to the development of reliable and specialized thinning techniques. Current programs explore the application of chemicals to shape the surfaces of thin films, the use of nanospheres for observation of small particles, and the

432

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

CM 200 FEG CM 200 FEG AEME The Philips CM200/FEG is a versatile instrument that is designed for analysis of the physical, chemical and magnetic microstructure at high spatial resolution. In addition to high resolution imaging capability, the machine is optimized for analytical electron microscopy and Lorentz imaging, under normal as well as dynamic conditions of variable temperature (77K - 1250K) and applied magnetic fields. Spatially resolved compositional analysis by X-ray emission spectroscopy (Z > 5), local electronic structure measurements by electron energy-loss spectroscopy (Z > 2), convergent beam electron diffraction for three-dimensional structure information, and energy-filtered imaging at the nanometer scale are some of the techniques available on this instrument. In addition, a TEM differential phase

433

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

SPLEEM SPLEEM Publications Imaging Spin Reorientation Transitions in Consecutive Atomic Co layers, Farid El Gabaly, Silvia Gallego, M. Carmen Munoz, Laszlo Szunyogh, Peter Weinberger, Kevin F. McCarty, Christof Klein, Andreas K. Schmid, Juan de la Figuera, submitted Direct imaging of spin-reorientation transitions in ultra-thin Ni films by spin-polarized low-energy electron microscopy, C. Klein, A. K. Schmid, R. Ramchal, and M. Farle, submitted Controlling the kinetic order of spin-reorientation transitions in Ni/Cu(100) films by tuning the substrate step-structure, C. Klein, R. Ramchal, A.K. Schmid, M. Farle, submitted Self-organization and magnetic domain microstructure of Fe nanowire arrays, N. Rougemaille and A.K. Schmid, submitted Self-Assembled Nanofold Network Formation on Layered Crystal Surfaces

434

Calibration of fluorescence resonance energy transfer in microscopy  

DOE Patents (OSTI)

Imaging hardware, software, calibrants, and methods are provided to visualize and quantitate the amount of Fluorescence Resonance Energy Transfer (FRET) occurring between donor and acceptor molecules in epifluorescence microscopy. The MicroFRET system compensates for overlap among donor, acceptor, and FRET spectra using well characterized fluorescent beads as standards in conjunction with radiometrically calibrated image processing techniques. The MicroFRET system also provides precisely machined epifluorescence cubes to maintain proper image registration as the sample is illuminated at the donor and acceptor excitation wavelengths. Algorithms are described that pseudocolor the image to display pixels exhibiting radiometrically-corrected fluorescence emission from the donor (blue), the acceptor (green) and FRET (red). The method is demonstrated on samples exhibiting FRET between genetically engineered derivatives of the Green Fluorescent Protein (GFP) bound to the surface of Ni chelating beads by histidine-tags.

Youvan, Douglas C. (San Jose, CA); Silva, Christopher M. (Sunnyvale, CA); Bylina, Edward J. (San Jose, CA); Coleman, William J. (Moutain View, CA); Dilworth, Michael R. (Santa Cruz, CA); Yang, Mary M. (San Jose, CA)

2002-09-24T23:59:59.000Z

435

In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry  

Science Conference Proceedings (OSTI)

Oxides and their tailored structures are at the heart of electrochemical energy storage technologies and advances in understanding and controlling the dynamic behaviors in the complex oxides, particularly at the interfaces, during electrochemical processes will catalyze creative design concepts for new materials with enhanced and better-understood properties. Such knowledge is not accessible without new analytical tools. New innovative experimental techniques are needed for understanding the chemistry and structure of the bulk and interfaces, more importantly how they change with electrochemical processes in situ. Analytical Transmission Electron Microscopy (TEM) is used extensively to study electrode materials ex situ and is one of the most powerful tools to obtain structural, morphological, and compositional information at nanometer scale by combining imaging, diffraction and spectroscopy, e.g., EDS (energy dispersive X-ray spectrometry) and Electron Energy Loss Spectrometry (EELS). Determining the composition/structure evolution upon electrochemical cycling at the bulk and interfaces can be addressed by new electron microscopy technique with which one can observe, at the nanometer scale and in situ, the dynamic phenomena in the electrode materials. In electrochemical systems, for instance in a lithium ion battery (LIB), materials operate under conditions that are far from equilibrium, so that the materials studied ex situ may not capture the processes that occur in situ in a working battery. In situ electrochemical operation in the ultra-high vacuum column of a TEM has been pursued by two major strategies. In one strategy, a 'nano-battery' can be fabricated from an all-solid-state thin film battery using a focused ion beam (FIB). The electrolyte is either polymer based or ceramic based without any liquid component. As shown in Fig. 1a, the interfaces between the active electrode material/electrolyte can be clearly observed with TEM imaging, in contrast to the composite electrodes/electrolyte interfaces in conventional lithium ion batteries, depicted in Fig.1b, where quantitative interface characterization is extremely difficult if not impossible. A second strategy involves organic electrolyte, though this approach more closely resembles the actual operation conditions of a LIB, the extreme volatility In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry by Ying Shirley Meng, Thomas McGilvray, Ming-Che Yang, Danijel Gostovic, Feng Wang, Dongli Zeng, Yimei Zhu, and Jason Graetz of the organic electrolytes present significant challenges for designing an in situ cell that is suitable for the vacuum environment of the TEM. Significant progress has been made in the past few years on the development of in situ electron microscopy for probing nanoscale electrochemistry. In 2008, Brazier et al. reported the first cross-section observation of an all solid-state lithium ion nano-battery by TEM. In this study the FIB was used to make a 'nano-battery,' from an all solid-state battery prepared by pulsed laser deposition (PLD). In situ TEM observations were not possible at that time due to several key challenges such as the lack of a suitable biasing sample holder and vacuum transfer of sample. In 2010, Yamamoto et al. successfully observed changes of electric potential in an all-solid-state lithium ion battery in situ with electron holography (EH). The 2D potential distribution resulting from movement of lithium ions near the positive-electrode/electrolyte interface was quantified. More recently Huang et al. and Wang et al. reported the in situ observations of the electrochemical lithiation of a single SnO{sub 2} nanowire electrode in two different in situ setups. In their approach, a vacuum compatible ionic liquid is used as the electrolyte, eliminating the need for complicated membrane sealing to prevent the evaporation of carbonate based organic electrolyte into the TEM column. One main limitation of this approach is that EELS spectral imaging is not possible due to the high plasmon signal of the ionic li

Graetz J.; Meng, Y.S.; McGilvray, T.; Yang, M.-C.; Gostovic, D.; Wang, F.; Zeng, D.; Zhu, Y.

2011-10-31T23:59:59.000Z

436

Aberration-Coreected Electron Microscopy at Brookhaven National Laboratory  

Science Conference Proceedings (OSTI)

The last decade witnessed the rapid development and implementation of aberration correction in electron optics, realizing a more-than-70-year-old dream of aberration-free electron microscopy with a spatial resolution below one angstrom [1-9]. With sophisticated aberration correctors, modern electron microscopes now can reveal local structural information unavailable with neutrons and x-rays, such as the local arrangement of atoms, order/disorder, electronic inhomogeneity, bonding states, spin configuration, quantum confinement, and symmetry breaking [10-17]. Aberration correction through multipole-based correctors, as well as the associated improved stability in accelerating voltage, lens supplies, and goniometers in electron microscopes now enables medium-voltage (200-300kV) microscopes to achieve image resolution at or below 0.1nm. Aberration correction not only improves the instrument's spatial resolution but, equally importantly, allows larger objective lens pole-piece gaps to be employed thus realizing the potential of the instrument as a nanoscale property-measurement tool. That is, while retaining high spatial resolution, we can use various sample stages to observe the materials response under various temperature, electric- and magnetic- fields, and atmospheric environments. Such capabilities afford tremendous opportunities to tackle challenging science and technology issues in physics, chemistry, materials science, and biology. The research goal of the electron microscopy group at the Dept. of Condensed Matter Physics and Materials Science and the Center for Functional Nanomaterials, as well as the Institute for Advanced Electron Microscopy, Brookhaven National Laboratory (BNL), is to elucidate the microscopic origin of the physical- and chemical-behavior of materials, and the role of individual, or groups of atoms, especially in their native functional environments. We plan to accomplish this by developing and implementing various quantitative electron microscopy techniques in strongly correlated electron systems and nanostructured materials. As a first step, with the support of Materials Science Division, Office of Basic Energy Science, US Department of Energy, and the New York State Office of Science, Technology, and Academic Research, recently we acquired three aberration-corrected electron microscopes from the three major microscope manufacturers, i.e., JEOL, Hitachi, and FEI. The Hitachi HD2700C is equipped with a probe corrector, the FEI Titan 80-300 has an imaging corrector, while the JEOL2200MCO has both. All the correctors are of the dual-hexapole type, designed and manufactured by CEOS GmbH based on the design due to Rose and Haider [3, 18]. All these three are one-of-a-kind in the US, designed for specialized capabilities in characterizing nanoscale structure. In this chapter, we review the performance of these state-of-the art instruments and the new challenges associated with the improved spatial resolution, including the environment requirements of the laboratory that hosts these instruments. Although each instrument we describe here has its own strengths and drawbacks, it is not our intention to rank them in terms of their performance, especially their spatial resolution in imaging.

Zhu,Y.; Wall, J.

2008-04-01T23:59:59.000Z

437

Handheld and low-cost digital holographic microscopy  

E-Print Network (OSTI)

This study developed handheld and low-cost digital holographic microscopy (DHM) by adopting an in-line type hologram, a webcam, a high power RGB light emitting diode (LED), and a pinhole. It cost less than 20,000 yen (approximately 250 US dollars at 80 yen/dollar), and was approximately 120 mm x 80 mm x 55 mm in size. In addition, by adjusting the recording-distance of a hologram, the lateral resolution power at the most suitable distance was 17.5 um. Furthermore, this DHM was developed for use in open source libraries, and is therefore low-cost and can be easily developed by anyone. In this research, it is the feature to cut down cost and size and to improve the lateral resolution power further rather than existing reports. This DHM will be a useful application in fieldwork, education, and so forth.

Shiraki, Atsushi; Shimobaba, Tomoyoshi; Masuda, Nobuyuki; Ito, Tomoyoshi

2012-01-01T23:59:59.000Z

438

Layout-Aware Multi-Layer Multi-Level Scan Tree Synthesis  

Science Conference Proceedings (OSTI)

In this paper, we propose a layout-aware scan tree synthesis methodology. Scan tree can greatly reduce test data volume, which is very desirable in SOC testing. However, previous researches on scan tree synthesis have not considered routing issues in ...

Sying-Jyan Wang; Xin-Long Li; Katherine Shu-Min Li

2007-10-01T23:59:59.000Z

439

Compact, low power radio frequency cavity for femtosecond electron microscopy  

Science Conference Proceedings (OSTI)

Reported here is the design, construction, and characterization of a small, power efficient, tunable dielectric filled cavity for the creation of femtosecond electron bunches in an existing electron microscope without the mandatory use of femtosecond lasers. A 3 GHz pillbox cavity operating in the TM{sub 110} mode was specially designed for chopping the beam of a 30 keV scanning electron microscope. The dielectric material used is ZrTiO{sub 4}, chosen for the high relative permittivity ({epsilon}{sub r}= 37 at 10 GHz) and low loss tangent (tan {delta}= 2 x 10{sup -4}). This allows the cavity radius to be reduced by a factor of six, while the power consumption is reduced by an order of magnitude compared to a vacuum pillbox cavity. These features make this cavity ideal as a module for existing electron microscopes, and an alternative to femtosecond laser systems integrated with electron microscopes.

Lassise, A.; Mutsaers, P. H. A.; Luiten, O. J. [Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven (Netherlands)

2012-04-15T23:59:59.000Z

440

In situ laser processing in a scanning electron microscope  

Science Conference Proceedings (OSTI)

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {micro}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas [University of Tennessee, Knoxville (UTK); Fowlkes, Jason Davidson [ORNL; Rack, Prof. Philip [University of Tennessee, Knoxville (UTK); Moore, Tom [OmniProbe, Inc.; Magel, Greg [OmniProbe, Inc.; Hartfield, Cheryl [OmniProbe, Inc.

2012-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
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to obtain the most current and comprehensive results.


441

In situ laser processing in a scanning electron microscope  

SciTech Connect

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {mu}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas A.; Magel, Gregory A.; Hartfield, Cheryl D.; Moore, Thomas M.; Fowlkes, Jason D.; Rack, Philip D. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

2012-07-15T23:59:59.000Z

442

Software requirements definition Shipping Cask Analysis System (SCANS)  

SciTech Connect

The US Nuclear Regulatory Commission (NRC) staff reviews the technical adequacy of applications for certification of designs of shipping casks for spent nuclear fuel. In order to confirm an acceptable design, the NRC staff may perform independent calculations. The current NRC procedure for confirming cask design analyses is laborious and tedious. Most of the work is currently done by hand or through the use of a remote computer network. The time required to certify a cask can be long. The review process may vary somewhat with the engineer doing the reviewing. Similarly, the documentation on the results of the review can also vary with the reviewer. To increase the efficiency of this certification process, LLNL was requested to design and write an integrated set of user-oriented, interactive computer programs for a personal microcomputer. The system is known as the NRC Shipping Cask Analysis System (SCANS). The computer codes and the software system supporting these codes are being developed and maintained for the NRC by LLNL. The objective of this system is generally to lessen the time and effort needed to review an application. Additionally, an objective of the system is to assure standardized methods and documentation of the confirmatory analyses used in the review of these cask designs. A software system should be designed based on NRC-defined requirements contained in a requirements document. The requirements document is a statement of a project's wants and needs as the users and implementers jointly understand them. The requirements document states the desired end products (i.e. WHAT's) of the project, not HOW the project provides them. This document describes the wants and needs for the SCANS system. 1 fig., 3 tabs.

Johnson, G.L.; Serbin, R.

1985-07-21T23:59:59.000Z

443

Refractive Optics for Hard X-ray Transmission Microscopy  

Science Conference Proceedings (OSTI)

For hard x-ray transmission microscopy at photon energies higher than 15 keV we design refractive condenser and imaging elements to be used with synchrotron light sources as well as with x-ray tube sources. The condenser lenses are optimized for low x-ray attenuation--resulting in apertures greater than 1 mm--and homogeneous intensity distribution on the detector plane, whereas the imaging enables high-resolution (condenser and imaging lenses are being developed. The imaging lenses (compound refractive lenses, CRLs) are made of SU-8 negative resist by deep x-ray lithography. SU-8 shows high radiation stability. The fabrication technique enables high-quality lens structures regarding surface roughness and arrangement precision with arbitrary 2D geometry. To provide point foci, crossed pairs of lenses are used. Condenser lenses have been made utilizing deep x-ray lithographic patterning of thick SU-8 layers, too, whereas in this case, the aperture is limited due to process restrictions. Thus, in terms of large apertures, condenser lenses made of structured and rolled polyimide film are more attractive. Both condenser types, x-ray mosaic lenses and rolled x-ray prism lenses (RXPLs), are considered to be implemented into a microscope setup. The x-ray optical elements mentioned above are characterized with synchrotron radiation and x-ray laboratory sources, respectively.

Simon, M.; Last, A.; Mohr, J.; Nazmov, V.; Reznikova, E. [Institute for Microstructure Technology, Karlsruhe Institute of Technology Kaiserstrasse 12, 76131 Karlsruhe (Germany); Ahrens, G.; Voigt, A. [Microresist Technology, Koepenikerstrasse 325, 12555 Berlin (Germany)

2011-09-09T23:59:59.000Z

444

TRANSMISSION ELECTRON MICROSCOPY STUDY OF HELIUM BEARING FUSION WELDS  

DOE Green Energy (OSTI)

A transmission electron microscopy (TEM) study was conducted to characterize the helium bubble distributions in tritium-charged-and-aged 304L and 21Cr-6Ni-9Mn stainless steel fusion welds containing approximately 150 appm helium-3. TEM foils were prepared from C-shaped fracture toughness test specimens containing {delta} ferrite levels ranging from 4 to 33 volume percent. The weld microstructures in the low ferrite welds consisted mostly of austenite and discontinuous, skeletal {delta} ferrite. In welds with higher levels of {delta} ferrite, the ferrite was more continuous and, in some areas of the 33 volume percent sample, was the matrix/majority phase. The helium bubble microstructures observed were similar in all samples. Bubbles were found in the austenite but not in the {delta} ferrite. In the austenite, bubbles had nucleated homogeneously in the grain interiors and heterogeneously on dislocations. Bubbles were not found on any austenite/austenite grain boundaries or at the austenite/{delta} ferrite interphase interfaces. Bubbles were not observed in the {delta} ferrite because of the combined effects of the low solubility and rapid diffusion of tritium through the {delta} ferrite which limited the amount of helium present to form visible bubbles.

Tosten, M; Michael Morgan, M

2008-12-12T23:59:59.000Z

445

Dual energy scanning beam laminographic x-radiography  

DOE Patents (OSTI)

A multiple x-ray energy level imaging system includes a scanning x-ray beam and two detector design having a first low x-ray energy sensitive detector and a second high x-ray energy sensitive detector. The low x-ray energy detector is placed next to or in front of the high x-ray energy detector. The low energy sensitive detector has small stopping power for x-rays. The lower energy x-rays are absorbed and converted into electrical signals while the majority of the higher energy x-rays pass through undetected. The high energy sensitive detector has a large stopping power for x-rays as well as it having a filter placed between it and the object to absorb the lower energy x-rays. In a second embodiment; a single energy sensitive detector is provided which provides an output signal proportional to the amount of energy in each individual x-ray it absorbed. It can then have an electronic threshold or thresholds set to select two or more energy ranges for the images. By having multiple detectors located at different positions, a dual energy laminography system is possible.

Majewski, Stanislaw (Grafton, VA); Wojcik, Randolph F. (Yorktown, VA)

1998-01-01T23:59:59.000Z

446

Dual energy scanning beam laminographic x-radiography  

DOE Patents (OSTI)

A multiple x-ray energy level imaging system includes a scanning x-ray beam and two detector design having a first low x-ray energy sensitive detector and a second high x-ray energy sensitive detector. The low x-ray energy detector is placed next to or in front of the high x-ray energy detector. The low energy sensitive detector has small stopping power for x-rays. The lower energy x-rays are absorbed and converted into electrical signals while the majority of the higher energy x-rays pass through undetected. The high energy sensitive detector has a large stopping power for x-rays as well as it having a filter placed between it and the object to absorb the lower energy x-rays. In a second embodiment; a single energy sensitive detector is provided which provides an output signal proportional to the amount of energy in each individual x-ray it absorbed. It can then have an electronic threshold or thresholds set to select two or more energy ranges for the images. By having multiple detectors located at different positions, a dual energy laminography system is possible. 6 figs.

Majewski, S.; Wojcik, R.F.

1998-04-21T23:59:59.000Z

447

Differential scanning calorimetry of metamict Pu-substituted zirconolite  

DOE Green Energy (OSTI)

Samples of CaPuTi/sub 2/O/sub 7/ were prepared by cold pressing and sintering. Plutonium was substituted for zirconium in order to characterize radiation damage effects. The energy stored in a sample which had reached saturation in swelling after storage at ambient temperature was measured with a differential scanning calorimeter. The total energy of 6.6 +- 0.1 cal/g is released over the range 485 to 715/sup 0/C. The activation energy of annealing of the damage is 1.22 +- 0.05 eV. The temperature dependence of the rate constant is described by k/sub T/ = 5.96E4 exp(-1.22/k/sub B/T) s/sup -1/ where kB and T are the Boltzmann's constant and temperature (K) respectively. A sample stored at 600/sup 0/C was similarly evaluated and showed no release of stored energy to the precision of the apparatus (+- 0.1 cal/g). These results are applied to analysis of waste incorporation in SYNROC and are correlated with analogous parameters for other materials.

Peterson, D.E.; Clinard, F.W. Jr.

1982-01-01T23:59:59.000Z

448

Review of Recent Results from the RHIC Beam Energy Scan  

E-Print Network (OSTI)

We review recent results from the RHIC beam energy scan (BES) program, aimed to study the Quantum Chromodynamics (QCD) phase diagram. The main goals are to search for the possible phase boundary, softening of equation of state or first order phase transition, and possible critical point. Phase-I of the BES program has recently concluded with data collection for Au+Au collisions at center-of-mass energies ($\\sqrt{s_{NN}}$) of 7.7, 11.5, 19.6, 27, and 39 GeV. Several interesting results are observed for these lower energies where the net-baryon density is high at the mid-rapidity. These results indicate that the matter formed at lower energies (7.7 and 11.5 GeV) is hadron dominated and might not have undergone a phase transition. In addition, the centrality dependence of freeze-out parameters is observed for the first time at lower energies, slope of directed flow for (net)-protons measured versus rapidity shows an interesting behavior at lower energies, and higher moments of net-proton show deviation from Skellam expectations at lower energies. An outlook for the future BES Phase-II program is presented and efforts for the detailed study of QCD phase diagram are discussed.

Lokesh Kumar

2013-11-14T23:59:59.000Z

449

Transmission electron microscopy analysis of corroded metal waste forms.  

SciTech Connect

This report documents the results of analyses with transmission electron microscopy (TEM) combined with energy dispersive X-ray spectroscopy (EDS) and selected area electron diffraction (ED) of samples of metallic waste form (MWF) materials that had been subjected to various corrosion tests. The objective of the TEM analyses was to characterize the composition and microstructure of surface alteration products which, when combined with other test results, can be used to determine the matrix corrosion mechanism. The examination of test samples generated over several years has resulted in refinements to the TEM sample preparation methods developed to preserve the orientation of surface alteration layers and the underlying base metal. The preservation of microstructural spatial relationships provides valuable insight for determining the matrix corrosion mechanism and for developing models to calculate radionuclide release in repository performance models. The TEM results presented in this report show that oxide layers are formed over the exposed steel and intermetallic phases of the MWF during corrosion in aqueous solutions and humid air at elevated temperatures. An amorphous non-stoichiometric ZrO{sub 2} layer forms at the exposed surfaces of the intermetallic phases, and several nonstoichiometric Fe-O layers form over the steel phases in the MWF. These oxide layers adhere strongly to the underlying metal, and may be overlain by one or more crystalline Fe-O phases that probably precipitated from solution. The layer compositions are consistent with a corrosion mechanism of oxidative dissolution of the steel and intermetallic phases. The layers formed on the steel and intermetallic phases form a continuous layer over the exposed waste form, although vertical splits in the layer and corrosion in pits and crevices were seen in some samples. Additional tests and analyses are needed to verify that these layers passivate the underlying metals and if passivation can break down as the MWF corrodes. The importance of localized corrosion should also be determined.

Dietz, N. L.

2005-04-15T23:59:59.000Z

450

Scanning tunneling microscopic studies of SiO2 thin film supported metal nano-clusters  

E-Print Network (OSTI)

This dissertation is focused on understanding heterogeneous metal catalysts supported on oxides using a model catalyst system of SiO2 thin film supported metal nano-clusters. The primary technique applied to this study is scanning tunneling microscopy (STM). The most important constituent of this model catalyst system is the SiO2 thin film, as it must be thin and homogeneous enough to apply electron or ion based surface science techniques as well as STM. Ultra-thin SiO2 films were successfully synthesized on a Mo(112) single crystal. The electronic and geometric structure of the SiO2 thin film was investigated by STM combined with LEED, Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). The relationship between defects on the SiO2 thin film and the nucleation and growth of metal nano-clusters was also investigated. By monitoring morphology changes during thermal annealing, it was found that the metal-support interaction is strongly dependent on the type of metal as well as on the defect density of the SiO2 thin film. Especially, it was found that oxygen vacancies and Si impurities play an important role in the formation of Pd-silicide. By substituting Ti atoms into the SiO2 thin film network, an atomically mixed TiO2-SiO2 thin film was synthesized. Furthermore, these Ti atoms play a role as heterogeneous defects, resulting in the creation of nucleation sites for Au nano-clusters. A marked increase in Au cluster density due to Ti defects was observed in STM. A TiO2-SiO2 thin film consisting of atomic Ti as well as TiOx islands was also synthesized by using higher amounts of Ti (17 %). More importantly, this oxide surface was found to have sinter resistant properties for Au nano-clusters, which are desirable in order to make highly active Au nano-clusters more stable under reaction conditions.

Min, Byoung Koun

2004-08-01T23:59:59.000Z

451

Low-Dose Spiral CT Scans for Early Lung Cancer Detection | Department of  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

Low-Dose Spiral CT Scans for Early Lung Cancer Detection Low-Dose Spiral CT Scans for Early Lung Cancer Detection Low-Dose Spiral CT Scans for Early Lung Cancer Detection Low-dose spiral computed tomography (CT) scanning is a noninvasive medical imaging test that has been used for the early detection of lung cancer for over 16 years (Sone et al. 1998; Henschke et.al. 1999). A low-dose spiral chest CT differs from a full-dose conventional chest CT scan primarily in the amount of radiation emitted during CT scans. Chest CT, in general, requires less radiation exposure than other CT procedures because the air-filled tissues of the lungs are not as dense as the tissues of other organs (i.e., less x-ray radiation is needed to penetrate the lung). Radiation dose can be further reduced with lung cancer screening due to the

452

A stochastic kinematic model of class averaging in single-particle electron microscopy  

Science Conference Proceedings (OSTI)

Single-particle electron microscopy is an experimental technique that is used to determine the three-dimensional (3D) structure of biological macromolecules and the complexes that they form. In general, image processing techniques and reconstruction ... Keywords: Class average, convolution, image alignment, single-particle electron microscopy

Wooram Park; Charles R Midgett; Dean R Madden; Gregory S Chirikjian

2011-05-01T23:59:59.000Z

453

Serial Section Registration of Axonal Confocal Microscopy Datasets for Long-Range Neural Circuit Reconstruction  

E-Print Network (OSTI)

of fluorescence con- focal microscopy. We are targeting neurons in a 12 mm-deep re- gion of interest and work, immunohistochemically stained, and placed on its own microscope slide for fluorescence confocal imaging. view). The histological techniques used to image neurons of interest in fluorescence confocal microscopy impose digital

Paiva, AntĂłnio R. C.

454

Phase Contrast Microscopy with Soft and Hard X-rays Using a Segmented  

E-Print Network (OSTI)

Phase Contrast Microscopy with Soft and Hard X-rays Using a Segmented Detector A Dissertation Contrast Microscopy with Soft and Hard X-rays Using a Segmented Detector by Benjamin Hornberger Doctor. In the hard x-ray range (multi-keV), the main focus lies on trace ele- ment mapping by x-ray fluorescence

455

Effect of Roughness as Determined by Atomic Force Microscopy on the Wetting Properties of PTFE Thin  

E-Print Network (OSTI)

Effect of Roughness as Determined by Atomic Force Microscopy on the Wetting Properties of PTFE Thin Engineering College of Mines and Earth Sciences University of Utah Salt Lake City, Utah 84112 and G. YAMAUCHI films has been investigated using atomic force microscopy (AFM) and contact angle goniometry. Surface

Drelich, Jaroslaw W.

456

Enhancing the Utility of ProstaScint SPECT Scans for Patient Management  

Science Conference Proceedings (OSTI)

This project investigated reducing the artifact content of In-111 ProstaScint SPECT scans for use in treatment planning and management. Forty-one patients who had undergone CT or MRI scans and simultaneous Tc-99m RBC/In-111 ProstaScint SPECT scans were ... Keywords: ProstaScint SPECT artifact elimination, Prostate cancer treatment planning., Reconstruction algorithms, Volume fusion, Volume subtraction

Marilyn E. Noz; Grace Chung; Benjamin Y. Lee; Gerald Q. Maguire, Jr.; J. Keith Dewyngaert; Jay V. Doshi; Elissa L. Kramer; Antoinette D. Murphy-Walcott; Michael P. Zeleznik; Noeun G. Kwak

2006-04-01T23:59:59.000Z

457

Prototype Near-Field/GIS Model for Sequestered-CO2 Risk Characterization and Management  

DOE Green Energy (OSTI)

Detecting unmapped abandoned wells thus remains a major carbon sequestration (CS) technology gap. Many (>10{sup 5}) abandoned wells are thought to lie in potential sequestration sites. For such wells, risk analysis to date has focused on aggregate long-term future impacts of seepage at rates < or << {approx}1 g m{sup 2} d{sup -1} on storage goals as sequestered plumes encroach upon wells with assumed distributions of seal ineffectiveness (Oldenburg and Unger, 2003; Saripali et al. 2003; Celia, 2005). However, unmapped abandoned wells include an unknown number without any effective seal at all, venting through which may dominate CO{sub 2}-loss scenarios. A model of such a well is Crystal Geyser (CG), a prospective oil well abandoned in the 1930s with no barrier installed after it encountered a natural CO{sub 2} reservoir rather than oil (Baer and Rigby, 1978; Rinehart, 1980). CG demonstrates how an unimpeded conduit to the surface now regularly vents from 10{sup 3} to >10{sup 4} kg of CO{sub 2} gas to the terrestrial surface (Figure 1). Unique field data recently gathered from Crystal Geyser (CG) in Utah (Gouveia et al. 2005) confirm that, although resulting surface CO{sub 2} concentrations resulting from CG-like eruptions would likely be safe in general, they could accumulate to pose lethal hazards under relatively rare meteorological and topographic (MT) conditions. This source of foreseeable risk needs to be managed if carbon sequestration is to be publicly accepted. To address this concern, we used CG field data to estimate the source term for a prototype model that identifies zones at relatively highly elevated risk for sequestered-CO{sub 2} casualties. Such a model could be applied both to design and comply with future regulatory requirements to survey high-risk zones in each proposed sequestration site for improperly sealed wells.

Bogen, K T; Homann, S G; Gouveia, F J; Neher, L A

2006-02-10T23:59:59.000Z

458

P2-25: Tracking Geometrical Features using Near-field High Energy ...  

Science Conference Proceedings (OSTI)

Combined with work in geometrical extraction and tracking, we are now able to follow thousands of grains and boundaries, often with extremely complex ...

459

Comments on "Near-field interference for the unidirectional excitation of electromagnetic guided modes"  

E-Print Network (OSTI)

Rodriguez-Fortuno et al. (19 April 2013, p. 330) reported the unidirectional excitation of electromagnetic guided modes via the oblique illumination of a circularly polarized light. This comment points out that the same scheme was addressed in our a-year-ahead paper and that magnetic dipoles play a key role in the unidirectional excitation which was neglected in Rodriguez-Fortuno et al.'s report.

Lee, Seung-Yeol; Kim, Kyoung-Youm; Lee, Byoungho

2013-01-01T23:59:59.000Z

460

Sound beyond the speed of light: destructive interference, anomalous dispersion and nonlocality of near field  

E-Print Network (OSTI)

Experimentally fixed sound pulse beyond of light speed in the region of anomalous dispersion [W. M. Robertson, e. a. Appl. Phys. Lett, 90, 014102 (2007)] can be explained, as well as the similar superluminal phenomena, by "the nonlocality in the small" of near electromagnetic field at transferring of relevanted excitations.

Perel'man, M E

2007-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "microscopy near-field scanning" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


461

Report on THMC Modeling of the Near Field Evolution of a Generic...  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

Field Evolution of a Generic Clay Repository: Model Validation and Demonstration Rev 2 Shale and clay-rich rock formations have been considered as potential host rocks for...

462

Volume II: near-field and altered-zone environment report  

Science Conference Proceedings (OSTI)

This report contains chapters 2-11 and the appendix covering topics such as hydrology, geochemistry, geomechanics, radiation effects, field testing and thermal tests.

Wilder, D.G.

1996-08-23T23:59:59.000Z

463

PIV Studies of Large Scale Structures in the Near Field of Small Aspect Ratio Elliptic Jets  

Science Conference Proceedings (OSTI)

The near flow field of small aspect ratio elliptic turbulent free jets (issuing from nozzle and orifice) was experimentally studied using a 2D PIV. Two point velocity correlations in these jets revealed the extent and orientation of the large scale structures ... Keywords: Axis switching, Elliptic jet, PIV, Spatial filtering, Two point correlation

G. Ramesh; L. Venkatakrishnan; A. Prabhu

2006-01-01T23:59:59.000Z

464

3D-vortex labyrinths in the near field of solid-state microchip laser  

E-Print Network (OSTI)

The spatiotemporal vortex lattices generated in high Fresnel number solid-state microchip lasers are studied in connection with Talbot phenomenon generic to spatially periodic electromagnetic fields. The spatial layout of light field is obtained via dynamical model based on Maxwell-Bloch equations for class-B laser, discrete Fox-Lee map with relaxation of inversion and static model based on superposition of copropagating Gaussian beams. The spatial patterns observed experimentally and obtained numerically are interpreted as nonlinear superposition of vortices with helicoidal phase dislocations. The usage of vortex labyrinths and Talbot lattices as optical dipole traps for neutral atoms is considered for the wavelength of trapping radiation in the range 0.98 $\\div$ 2.79 $\\mu m$. The separable optical trapping potential is mounted as a sum of array of vortex lines and additional parabolic subtrap. The factorization of macroscopic wavefunction have led to analytical solution of Gross-Pitaevski equation for ground state of ensemble of quantum particles trapped in vortex labyrinth and in spatially - periodic array of Gaussian beams.

A. Yu. Okulov

2007-01-21T23:59:59.000Z

465

Velocity measurements in the near field of a diesel fuel injector by ultrafast imagery  

E-Print Network (OSTI)

This paper examines the velocity profile of fuel issuing from a high-pressure single-orifice diesel injector. Velocities of liquid structures were determined from time-resolved ultrafast shadow images, formed by an amplified two-pulse laser source coupled to a double-frame camera. A statistical analysis of the data over many injection events was undertaken to map velocities related to spray formation near the nozzle outlet as a function of time after start of injection. These results reveal a strong asymmetry in the liquid profile of the test injector, with distinct fast and slow regions on opposite sides of the orifice. Differences of ~100 m/s can be observed between the 'fast' and 'slow' sides of the jet, resulting in different atomization conditions across the spray. On average, droplets are dispersed at a greater distance from the nozzle on the 'fast' side of the flow, and distinct macrostructure can be observed under the asymmetric velocity conditions. The changes in structural velocity and atomization b...

Sedarsky, David

2013-01-01T23:59:59.000Z

466

THz near-field imaging of biological tissues employing synchrotron radiation  

E-Print Network (OSTI)

A. Kleinman, “Cherenkov radiation from femtosecond opticalcoherent u u synchrotron radiation detected at BESSY II,”High-power terahertz radiation from relativistic electrons,”

Schade, Ulrich; Holldack, Karsten; Martin, Michael C.; Fried, Daniel

2004-01-01T23:59:59.000Z

467

3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone at the  

NLE Websites -- All DOE Office Websites (Extended Search)

3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone 3D View Inside the Skeleton with X-ray Microscopy: Imaging Bone at the Nanoscale Scientists studying osteoporosis and other skeletal diseases are interested in the 3D structure of bone and its responses to conditions such as weightlessness, radiation (of particular interest to astronauts) and vitamin D deficiency. The current gold standard, micro-computed tomography (micro-CT), provides 3D images of trabeculae, the small interior struts of bone tissue, and electron microscopy can provide nanometer resolution of thin tissue slices. Hard X-ray transmission microscopy has provided the first 3D view of bone structure within individual trabeculae on the nanoscale. figure 1 Figure 1 Micro-CT (left) shows trabecular structure inside of bone. Transmission X-ray microscopy (TXM; center and right) can reveal localized details of osteocyte lacunae and their processes.

468

Video Scanning Hartmann Optical Testing of State-of-the-Art Parabolic Trough Concentrators: Preprint  

DOE Green Energy (OSTI)

This paper describes the Video Scanning Hartmann Optical Test System (VSHOT) used to optically test parabolic trough designs by both Solargenix and Industrial Solar Technology.

Wendelin, T.; May, K.; Gee, R.

2006-06-01T23:59:59.000Z

469

The Use of Micro-X-ray Fluorescence in a Scanning Electron ...  

Science Conference Proceedings (OSTI)

An X-ray gun with focusing capillary fiber optics interfaced with a scanning electron microscope (SEM) is used for semi-quantitative XRF microanalysis by energy ...

470

In Situ Transmission Electron Microscopy Characterization of Nanomaterials  

E-Print Network (OSTI)

With the recent development of in situ transmission electron microscopy (TEM) characterization techniques, the real time study of property-structure correlations in nanomaterials becomes possible. This dissertation reports the direct observations of deformation behavior of Al2O3-ZrO2-MgAl2O4 (AZM) bulk ceramic nanocomposites, strengthening mechanism of twins in YBa2Cu3O7-x (YBCO) thin film, work hardening event in nanocrystalline nickel and deformation of 2wt% Al doped ZnO (AZO) thin film with nanorod structures using the in situ TEM nanoindentation tool. The combined in situ movies with quantitative loading-unloading curves reveal the deformation mechanism of the above nanomaterial systems. At room temperature, in situ dynamic deformation studies show that the AZM nanocomposites undergo the deformation mainly through the grain-boundary sliding and rotation of small grains, i.e., ZrO2 grains, and some of the large grains, i.e., MgAl2O4 grains. We observed both plastic and elastic deformations in different sample regions in these multi-phase ceramic nanocomposites at room temperature. Both ex situ (conventional) and in situ nanoindentation were conducted to reveal the deformation of YBCO films from the directions perpendicular and parallel to the twin interfaces. Hardness measured perpendicular to twin interfaces is ~50% and 40% higher than that measured parallel to twin interfaces, by ex situ and in situ, respectively. By using an in situ nanoindentation tool inside TEM, dynamic work hardening event in nanocrystalline nickel was directly observed. During stain hardening stage, abundant Lomer-Cottrell (L-C) locks formed both within nanograins and against twin boundaries. Two major mechanisms were identified during interactions between L-C locks and twin boundaries. Quantitative nanoindentation experiments recorded during in situ experiments show an increase of yield strength from 1.64 to 2.29 GPa during multiple loading-unloading cycles. In situ TEM nanoindentation has been conducted to explore the size dependent deformation behavior of two different types (type I: ~ 0.51 of width/length ratio and type II: ~ 088 ratio) of AZO nanorods. During the indentation on type I nanord structure, annihilation of defects has been observed which is caused by limitation of the defect activities by relatively small size of the width. On the other hand, type II nanorod shows dislocation activities which enhanced the grain rotation under the external force applied on more isotropic direction through type II nanorod.

Lee, Joon Hwan 1977-

2012-12-01T23:59:59.000Z

471

Correlation between resistance-change effect in transition-metal oxides and secondary-electron contrast of scanning electron microscope images  

Science Conference Proceedings (OSTI)

Conductive atomic-force microscopy (C-AFM) writing is attracting attention as a technique for clarifying the switching mechanism of resistive random-access memory by providing a wide area filled with filaments, which can be regarded as one filament with large radius. The writing area on a nickel-oxide (NiO) film formed by conductive atomic-force microscopy was observed by scanning electron microscope, and a correlation between the contrast in a secondary-electron image (SEI) and the resistance written by C-AFM was revealed. In addition, the dependence of the SEI contrast on the beam accelerating voltage (V{sub accel}) suggests that the resistance-change effect occurs near the surface of the NiO film. As for the effects of electron irradiation and vacuum annealing on the C-AFM writing area, it was shown that the resistance-change effect is caused by exchange of oxygen with the atmosphere at the surface of the NiO film. This result suggests that the low-resistance and high-resistance areas are, respectively, p-type Ni{sub 1+{delta}}O ({delta} =} 0).

Kinoshita, K.; Kishida, S. [Department of Information and Electronics, Graduate School of Engineering, Tottori University, 4-101 Koyama-Minami, Tottori 680-8552 (Japan); Tottori University Electronic Display Research Center, 522-2 Koyama-Kita, Tottori 680-0941 (Japan); Yoda, T. [Department of Information and Electronics, Graduate School of Engineering, Tottori University, 4-101 Koyama-Minami, Tottori 680-8552 (Japan)

2011-09-15T23:59:59.000Z

472

NIST Reference Materials Are 'Gold Standard' for Bio ...  

Science Conference Proceedings (OSTI)

... atomic force microscopy (AFM), transmission electron microscopy (TEM), scanning electron microscopy (SEM), differential mobility analysis (DMA ...

2012-03-19T23:59:59.000Z

473

Collaborating for a "Perfect" Scan of Nuclear Matter ON THE COVER  

E-Print Network (OSTI)

FALL 2008 Collaborating for a "Perfect" Scan of Nuclear Matter #12;ON THE COVER With just.com ENERGY U.S. DEPARTMENT OF #12;2 Collaborating for a "Perfect" Scan of nuclear Matter 6 basic research For Energy Security 18 new radiation detector technology will Help Secure u.S. Cities 14 Capturing the Light

Ohta, Shigemi

474

Joint Estimation of Attenuation and Emission Images from PET Scans Hakan Erdogan and Jeffrey A. Fessler  

E-Print Network (OSTI)

Joint Estimation of Attenuation and Emission Images from PET Scans Hakan Erdogan and Jeffrey A information about the attenuating medium. To use all the available information, we propose a joint estimation optimal use of the information in these two scans, one can derive a joint objective function based on both

Erdogan, Hakan

475

SCAN-Based Compression-Encryption-Hiding for Video on Demand  

Science Conference Proceedings (OSTI)

We present a SCAN-based method for image and video compression-encryption-hiding with application to digital video-on-demand. The software SCAN implementation running on a Pentium IV takes about one second for 25 video frames. As an alternative solution, ... Keywords: Image Video Compression, encryption, information hiding, FPGA, Multimedia on demand

Nikolaos Bourbakis; Apostolos Dollas

2003-07-01T23:59:59.000Z

476

Robust Segmentation and Anatomical Labeling of the Airway Tree from Thoracic CT Scans  

Science Conference Proceedings (OSTI)

A method for automatic extraction and labeling of the airway tree from thoracic CT scans is presented and extensively evaluated on 150 scans of clinical dose, low dose and ultra-low dose data, in inspiration and expiration from both relatively healthy ...

Bram Ginneken; Wouter Baggerman; Eva M. Rikxoort

2008-09-01T23:59:59.000Z

477

Microprocessor system to recover data from a self-scanning photodiode array  

SciTech Connect

A microprocessor system developed at Lawrence Livermore Laboratory has expedited the recovery of data describing the low energy x-ray spectra radiated by laser-fusion targets. An Intel microprocessor controls the digitization and scanning of the data stream of an x-ray-sensitive self-scanning photodiode array incorporated in a crystal diffraction spectrometer. (auth)

Koppel, L.N.; Gadd, T.J.

1975-11-01T23:59:59.000Z

478

Measurement of Ocean Wave Directional Spectra Using Doppler Side-Scan Sonar Arrays  

Science Conference Proceedings (OSTI)

A technique is presented for extraction of ocean wave directional spectra using Doppler side-scan sonars. Two 103-kHz steerable side-scan beams from a freely drifting subsurface platform are used to estimate horizontal water surface velocity due ...

Mark V. Trevorrow

1995-06-01T23:59:59.000Z

479

Scanning Eye-Safe Elastic Backscatter Lidar at 1.54 ?m  

Science Conference Proceedings (OSTI)

A field-deployable scanning direct-detection elastic backscatter lidar system that is eye safe at all ranges is presented. The first two-dimensional spatial images created by scanning this new 1.54-?m wavelength system, and time-lapse animations (...

Scott M. Spuler; Shane D. Mayor

2005-06-01T23:59:59.000Z

480

Scanning Doppler Lidar for Input into Short-Term Wind Power Forecasts  

Science Conference Proceedings (OSTI)

Scanning Doppler lidar is a promising technology for improvements in short-term wind power forecasts since it can scan close to the surface and produce wind profiles at a large distance upstream (15–30 km) if the atmosphere has sufficient aerosol ...

Rod Frehlich

2013-02-01T23:59:59.000Z