National Library of Energy BETA

Sample records for general sciences beamlines

  1. SPOT Suite Transforms Beamline Science

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    SPOT Suite Transforms Beamline Science SPOT Suite Transforms Beamline Science SPOT Suite brings advanced algorithms, high performance computing and data management to the masses August 18, 2014 Contact: Linda Vu, +1 510 495 2402, lvu@lbl.gov als.jpg Advanced Light Source (ALS) at Berkeley Lab (Photo by Roy Kaltschmidt) Some mysteries of science can only be explained on a nanometer scale -even smaller than a single strand of human DNA, which is about 2.5 nanometers wide. At this scale, scientists

  2. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION...

  3. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source...

  4. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION...

  5. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION...

  6. Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Beamlines Print Beamlines Directory List of ALS beamlines, techniques, energy ranges, beamline scientists' contact information, and individual beamline schedules. The ALS Beamclock and links to the ALS Energy-Related Beamlines poster and beamclock are also available. Beam Status Current status of the ALS accelerator, updated every minute. Instructions on how to get beam status updates via Twitter @ALSRingStatus or text messages, and request form for beam history information. Research

  7. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source...

  8. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  9. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  10. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE...

  11. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes...

  12. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes...

  13. Beamlines & Facilities

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Imaging Group: Beamlines The X-ray Micrscopy and Imaging Group operates several beamlines and facilities. The bending magnet beamline (2-BM) entertaines 2 general user programs in...

  14. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION...

  15. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE...

  16. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline Scientific Applications SAXSWAXS Solution Scattering Fiber diffraction Anomalous SAXS Source characteristics Bending Magnet Port 6A Electron Beam energy 1.3 GeV Dipole...

  17. Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Micromachining X-ray Lithography Micromachining I (XRLM1), Port 2A, 10 mrad (Updated) X-ray lithography beamline for microfabrication. Two mode of operation, "white" and "mirror" light. Two Beryllium windows, 100 µm and 120 µm. Distance source point - mask plane 10.35 meter. DEX 02 scanner, from Jenoptik GmbH. Micromachining II (XRLM2), Port 2B, 10 mrad (Updated) X-ray lithography beamline for microfabrication. Full spectrum, "white light" beamline. Two

  18. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lisa Bovenkamp CAMD SAXS Beamline Schedule Your browser does not appear to support JavaScript, but this page needs to use JavaScript to display correctly. You can visit the...

  19. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline Every NIF beam starts at the master oscillator. The low-energy beam is amplified in the preamplifier module and then in the power amplifier, the main amplifier, and again in the power amplifier before the beam is run through the switchyard and into the target chamber

  20. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open...

  1. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users....

  2. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  3. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  4. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  5. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  6. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  7. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  8. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  9. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  10. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  11. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  12. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  13. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  14. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 10.3.2 Print Tuesday, 20 October 2009 09:15 Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7

  15. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: 17 keV transmission though...

  16. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through...

  17. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 3.1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission...

  18. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables

  19. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables

  20. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables

  1. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Beamline 7.0.2 Print Tuesday, 20 October 2009 08:45 Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system,

  2. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 9.3.2 Print Tuesday, 20 October 2009 09:06 Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011

  3. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Beamline 6.1.2 Print Tuesday, 20 October 2009 08:41 Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE)

  4. The New Structural Materials Science Beamlines BL8A and 8B at Photon Factory

    SciTech Connect (OSTI)

    Nakao, A.; Sugiyama, H.; Koyama, A.; Watanabe, K.

    2010-06-23

    BL8A and 8B are new beamlines for structural materials science at Photon Factory. The primary characteristics of both beamlines are similar. The incident beam is monochromatized by the Si(111) double-flat crystal monochromator and focused at the sample position by a Rh-coated bent cylindrical quartz mirror. The Weissenberg-camera-type imaging-plate (IP) diffractometers were installed. The X-ray diffraction experiments for structural studies of strongly correlated materials, such as transition metals, molecular conductors, endohedral fullerenes, nano-materials, etc, are conducted at these stations.

  5. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Note: This beamline is NOT open to general users. 3-20 keV S. Bailey (510) 486-7727 M. Banda (510) 495-2837 x2104 10.3.2 Bend Environmental and materials science, micro x-ray...

  6. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Beamline 1.4.3 Print Tuesday, 20 October 2009 08:08 FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science,...

  7. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  8. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  9. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  10. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  11. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  12. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron

  13. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported

  14. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported

  15. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    11.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  16. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  17. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  18. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    11.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  19. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  20. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  1. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  2. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  3. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  4. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  5. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  6. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  7. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  8. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  9. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  10. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  11. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  12. Beamline 11.3.1

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    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE...

  13. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE...

  14. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic,...

  15. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  16. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  17. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  18. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  19. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    10.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  20. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  1. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  2. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  3. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  4. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  5. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  6. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Beamline 12.0.2 Print Tuesday, 20 October 2009 09:30 Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving

  7. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Beamline 7.3.3 Print Tuesday, 20 October 2009 08:50 Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC

  8. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  9. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  10. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 8.3.2 Print Tuesday, 20 October 2009 08:56 Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft

  11. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Bend Diagnostic beamline Note: This beamline is NOT open to general users. 1-2 keV W. Byrne (510) 486-7517 This e-mail address is being protected from spambots. You need...

  12. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  13. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  14. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.1.2 Beamline 6.1.2 Print Tuesday, 20 October 2009 08:41 Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700

  15. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in

  16. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in

  17. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Beamline 6.0.2 Print Tuesday, 20 October 2009 08:40 Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond

  18. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  19. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  20. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  1. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  2. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  3. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  4. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 9.3.1 Print Tuesday, 20 October 2009 09:03 Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm

  5. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  6. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  7. APS Beamline 6-ID-D

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    D Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-D Beamline 6-ID-D is operated by the Magnetic Materials Group in the X-ray Science...

  8. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 11.0.1 Print Tuesday, 20 October 2009 09:16 PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving

  9. Beamline 12.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Beamline 12.0.1 Print Tuesday, 20 October 2009 09:23 EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation

  10. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated

  11. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000

  12. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.3.2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000

  13. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000

  14. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  15. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  16. Beamline 6.3.1

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    3.1 Beamline 6.3.1 Print Tuesday, 20 October 2009 08:42 Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000

  17. Beamline 9.0.1

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    9.0.1 Beamline 9.0.1 Print Tuesday, 20 October 2009 08:57 Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9

  18. Beamline 9.0.1

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    9.0.1 Beamline 9.0.1 Print Tuesday, 20 October 2009 08:57 Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9

  19. Beamline 9.0.1

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    0.1 Beamline 9.0.1 Print Tuesday, 20 October 2009 08:57 Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9 GeV,

  20. Beamline 12.3.1

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    3.1 Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated

  1. Beamline 4.0.2

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    Beamline 4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole...

  2. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  3. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  4. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  5. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  6. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  7. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  8. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  9. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  10. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  11. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  12. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  13. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  14. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  15. Beamline 8.3.1

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    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational...

  16. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  17. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  18. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  19. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  20. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  1. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  2. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  3. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  4. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  5. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  6. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  7. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  8. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  9. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  10. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  11. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  12. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  13. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  14. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  15. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  16. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 3.1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is

  17. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  18. Beamline 1.4.4

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    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

  19. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  20. Beamline 12.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  1. Beamline 12.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  2. Beamline 12.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  3. Beamline 12.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  4. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  5. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  6. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  7. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  8. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  9. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  10. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  11. Beamline 12.3.1

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    3.1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  12. Beamline 12.3.1

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    12.3.1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  13. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  14. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  15. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  16. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  17. Beamline 1.4.3

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    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  18. Beamline 1.4.4

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    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

  19. Beamline 1.4.4

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    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

  20. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  1. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  2. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  3. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials...

  4. Beamline 4.0.2

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    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet...

  5. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  6. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  7. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  8. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  9. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  10. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  11. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  12. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  13. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  14. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  15. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  16. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  17. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  18. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  19. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  20. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  1. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  2. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  3. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  4. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  5. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  6. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  7. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  8. Beamline 8.3.2

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    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  9. Beamline 8.3.2

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    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  10. Beamline 8.3.2

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    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  11. Beamline 8.3.2

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    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  12. Beamline 8.3.2

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    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  13. Beamline 8.3.2

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    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  14. Beamline 8.3.2

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    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  15. Beamline 8.3.2

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    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  16. Beamline 8.3.2

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    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  17. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  18. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  19. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  20. Beamline 8.3.2

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    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  1. Beamline 8.3.2

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    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  2. Beamline 6.1.2

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    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  3. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  4. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  5. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  6. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  7. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  8. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  9. Beamlines | Advanced Photon Source

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    Beamlines Beamlines Home Beamlines Directory Research Techniques Sectors Directory Status and Schedule Safety and Training Beamlines The Advanced Photon Source consists of 34...

  10. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm...

  11. Beamline 8.3.1

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    3.1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational...

  12. Beamline 12.2.2

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    20 October 2009 09:31 High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE...

  13. Beamline 4.0.3

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    spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range...

  14. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  15. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  16. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond

  17. Beamline 6.0.2

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    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  18. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  19. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  20. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  1. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  2. Beamline 9.3.1

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    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  3. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  4. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  5. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  6. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  7. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  8. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  9. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  10. Beamline 3.1

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    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  11. Beamline 3.1

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    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  12. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  13. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  14. Beamline 10.3.1

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    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  15. Beamline 10.3.1

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    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  16. Beamline 10.3.1

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    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  17. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  18. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  19. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  20. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  1. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  2. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  3. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  4. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  5. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  6. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  7. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  8. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  9. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  10. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  11. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  12. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  13. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  14. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  15. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  16. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  17. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  18. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  19. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  20. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  1. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  2. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  3. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.3.1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  4. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  5. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  6. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  7. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  8. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  9. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  10. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  11. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  12. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300

  13. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300

  14. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300

  15. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  16. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  17. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  18. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9 GeV, 400 mA) 2.8 x 1015 photons/s/1%BW/central

  19. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    9.0.1 Print Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9 GeV, 400 mA) 2.8 x 1015 photons/s/1%BW/central

  20. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9 GeV, 400 mA) 2.8 x 1015 photons/s/1%BW/central cone

  1. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  2. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  3. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  4. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  5. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  6. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  7. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  8. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  9. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  10. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  11. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  12. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  13. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  14. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 9.0.2 Beamline 9.0.2 Print Tuesday, 20 October 2009 08:59 Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental)

  15. Low-energy ion beamline scattering apparatus for surface science investigations

    SciTech Connect (OSTI)

    Gordon, M.J.; Giapis, K.P.

    2005-08-15

    We report on the design, construction, and performance of a high current (monolayers/s), mass-filtered ion beamline system for surface scattering studies using inert and reactive species at collision energies below 1500 eV. The system combines a high-density inductively coupled plasma ion source, high-voltage floating beam transport line with magnet mass-filter and neutral stripping, decelerator, and broad based detection capabilities (ions and neutrals in both mass and energy) for products leaving the target surface. The entire system was designed from the ground up to be a robust platform to study ion-surface interactions from a more global perspective, i.e., high fluxes (>100 {mu}A/cm{sup 2}) of a single ion species at low, tunable energy (50-1400{+-}5 eV full width half maximum) can be delivered to a grounded target under ultrahigh vacuum conditions. The high current at low energy problem is solved using an accel-decel transport scheme where ions are created at the desired collision energy in the plasma source, extracted and accelerated to high transport energy (20 keV to fight space charge repulsion), and then decelerated back down to their original creation potential right before impacting the grounded target. Scattered species and those originating from the surface are directly analyzed in energy and mass using a triply pumped, hybrid detector composed of an electron impact ionizer, hemispherical electrostatic sector, and rf/dc quadrupole in series. With such a system, the collision kinematics, charge exchange, and chemistry occurring on the target surface can be separated by fully analyzing the scattered product flux. Key design aspects of the plasma source, beamline, and detection system are emphasized here to highlight how to work around physical limitations associated with high beam flux at low energy, pumping requirements, beam focusing, and scattered product analysis. Operational details of the beamline are discussed from the perspective of available beam current, mass resolution, projectile energy spread, and energy tunability. As well, performance of the overall system is demonstrated through three proof-of-concept examples: (1) elastic binary collisions at low energy (2) core-level charge exchange reactions involving {sup 20}Ne{sup +} with Mg/Al/Si/P targets, and (3) reactive scattering of CF{sub 2}{sup +}/CF{sub 3}{sup +} off Si. These studies clearly demonstrate why low, tunable incident energy, as well as mass and energy filtering of products leaving the target surface is advantageous and often essential for studies of inelastic energy losses, hard-collision charge exchange, and chemical reactions that occur during ion-surface scattering.

  16. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 11.3.1 Beamline 11.3.1 Print Tuesday, 20 October 2009 09:22 Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8

  17. Beamline 12.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Beamline 12.0.1 Print Tuesday, 20 October 2009 09:23 EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science,...

  18. Beamline 3.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator...

  19. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Directory ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information.

  20. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  1. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  2. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  3. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  4. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: ~17 keV transmission though Mo filters Port 2: IR-visible from large-angle synchrotron radiation; UV-x-ray for beam position monitor (BPM) Endstations Port 1: Hard x-ray to visible converter (phosphor) Port 2: None (available for temporary experiments) Both ports are inside the ALS shielding. Characteristics Port 1: Pinhole-based x-ray system for

  5. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: ~17 keV transmission though Mo filters Port 2: IR-visible from large-angle synchrotron radiation; UV-x-ray for beam position monitor (BPM) Endstations Port 1: Hard x-ray to visible converter (phosphor) Port 2: None (available for temporary experiments) Both ports are inside the ALS shielding. Characteristics Port 1: Pinhole-based x-ray system for

  6. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    You need JavaScript enabled to view it (510) 486-6028 x2031 3.2.1 Bend Commercial deep-etch x-ray lithography (LIGA) Note: This beamline is NOT open to general users. 3-12...

  7. Beamline Vacuum

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Vacuum Energy: 3.0000 GeV Current: 494.8585 mA Ring Pres.: 1.1e-09 Torr Date: 09-Jan-2016 04:19:08 Beamline Vacuum Energy 3.0000 GeV Current 494.9 mA Vacuum 1.1e-09 Torr...

  8. Beamline Temperatures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Temperatures Energy: 3.0000 GeV Current: 495.5347 mA Date: 09-Jan-2016 04:18:38 Beamline Temperatures Energy 3.0000 GeV Current 495.5 mA 09-Jan-2016 04:18:38 LN:MainTankLevel 112.0...

  9. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1...

  10. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1...

  11. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational...

  12. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range...

  13. Beamlines Directory | Advanced Photon Source

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines: Find a Beamline Beamlines Directory Research Techniques Sectors Directory Status and Schedule Safety and Training back to Beamlines Directory 120213...

  14. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling from

  15. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling from

  16. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling from

  17. BEAMLINE 14-3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4-3 CURRENT STATUS: This beam line is in design. SUPPORTED TECHNIQUES: Low Energy XAS MAIN SCIENTIFIC DISCIPLINES: % TIME GENERAL USE: SCHEDULING: SOURCE: BEAM LINE SPECIFICATIONS: energy range resolution DE/E spot size flux angular acceptance focused unfocused OPTICS: MONOCHROMATOR: ABSORPTION: INSTRUMENTATION: DATA ACQUISITION AND ANALYSIS: RESPONSIBLE STAFF: BEAM LINE PHONE NUMBER: GENERAL DESCRIPTION: SCIENTIFIC APPLICATIONS / SELECTED RESULTS: April 17, 2009: SSRL Beamline 14 Sees First

  18. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 11.3.1 Print Tuesday, 20 October 2009 09:22 Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford

  19. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 11.3.1 Print Tuesday, 20 October 2009 09:22 Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford

  20. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Beamline 5.0.1 Print Tuesday, 20 October 2009 08:32 Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving

  1. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.2 Beamline 5.0.2 Print Tuesday, 20 October 2009 08:35 Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with

  2. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm

  3. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm

  4. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm

  5. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.4.1 Beamline 5.4.1 Print Wednesday, 16 June 2010 16:03 Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence

  6. Khazanah Nasional Berhad Beijing China Sciences General Energy...

    Open Energy Info (EERE)

    Khazanah Nasional Berhad Beijing China Sciences General Energy JV Jump to: navigation, search Name: Khazanah Nasional Berhad & Beijing China Sciences General Energy JV Place: China...

  7. Beijing China Sciences General Energy Environment GEE | Open...

    Open Energy Info (EERE)

    Sciences General Energy Environment GEE Jump to: navigation, search Name: Beijing China Sciences General Energy&Environment (GEE) Place: Beijing Municipality, China Zip: 100080...

  8. Environmental Remediation Science at Beamline X26A at the National Synchrotron Light Source- Final Report

    SciTech Connect (OSTI)

    Bertsch, Paul

    2013-11-07

    The goal of this project was to provide support for an advanced X-ray microspectroscopy facility at the National Synchrotron Light Source, Brookhaven National Laboratory. This facility is operated by the University of Chicago and the University of Kentucky. The facility is available to researchers at both institutions as well as researchers around the globe through the general user program. This facility was successfully supported during the project period. It provided access to advanced X-ray microanalysis techniques which lead to fundamental advances in understanding the behavior of contaminants and geochemistry that is applicable to environmental remediation of DOE legacy sites as well as contaminated sites around the United States and beyond.

  9. 4-ID beamline layout

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Sector 4 beamline layout Overview Sector 4 uses a canted undulator straight section to operate two beamlines The 4-ID-C beamline operates between 500 and 3000 eV while the 4-ID-D...

  10. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

  11. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

  12. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

  13. Center for Nanophase Materials Sciences (CNMS) - General Characterization

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Facilities GENERAL CHARACTERIZATION FACILITIES Neutron Scattering CNMS users are encouraged to take advantage of the world-class neutron scattering facilities that are available at ORNL's High-Flux Isotope Reactor (HFIR) and the Spallation Neutron Source (SNS). Beamlines of particular relevance to CNMS Scientific Themes include the small-angle scattering and diffractometry instruments on the HFIR cold source, HFIR thermal neutron diffraction and spectroscopy capabilities, and

  14. Instrumentation upgrades for the Macromolecular Crystallography beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    of the Swiss Light Source | Stanford Synchrotron Radiation Lightsource Instrumentation upgrades for the Macromolecular Crystallography beamlines of the Swiss Light Source Monday, October 29, 2012 - 2:00am SSRL, Bldg. 137, Rm. 322 Martin Fuchs, MX Group, Swiss Light Source; Paul Scherrer Institute (Villigen, Switzerland) A new unified diffractometer - the D3 - has been developed for the three MX beamlines. The first of the instruments is in general user operation at beamline X10SA since April

  15. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Director's Office Beamline 6.0.1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and

  16. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  17. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  18. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  19. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  20. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  1. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  2. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  3. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  4. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  5. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  6. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker

  7. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  8. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  9. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  10. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  11. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 11.3.2 Print Tuesday, 20 October 2009 09:23 Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5

  12. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  13. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  14. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  15. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0

  16. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0

  17. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator

  18. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator

  19. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Beamline 5.0.2 Print Tuesday, 20 October 2009 08:35 Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad

  20. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  1. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  2. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  3. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  4. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  5. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  6. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  7. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  8. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.2.2 Beamline 8.2.2 Print Tuesday, 20 October 2009 08:54 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot

  9. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 8.2.2 Print Tuesday, 20 October 2009 08:54 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size

  10. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.3.1 Beamline 8.3.1 Print Tuesday, 20 October 2009 08:55 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x

  11. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 8.3.1 Print Tuesday, 20 October 2009 08:55 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35

  12. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  13. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Beamline 12.2.2 Print Tuesday, 20 October 2009 09:31 High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90

  14. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  15. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  16. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 8.3.1 Print Tuesday, 20 October 2009 08:55 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35

  17. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Beamline 5.3.1 Print Tuesday, 20 October 2009 08:37 Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment

  18. A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source

    SciTech Connect (OSTI)

    Advanced Light Source; Kunz, Martin; Tamura, Nobumichi; Chen, Kai; MacDowell, Alastair A.; Celestre, Richard S.; Church, Matthew M.; Fakra, Sirine; Domning, Edward E.; Glossinger, James M.; Kirschman, Jonathan L.; Morrison, Gregory Y.; Plate, Dave W.; Smith, Brian V.; Warwick, Tony; Padmore, Howard A.; Ustundag, Ersan; Yashchuk, Valeriy V.

    2009-03-24

    A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T superconducting bending magnet (superbend) This provides a hard x-ray spectrum from 5 to 22 keV and a flux within a 1 mu m spot of ~;;5x109 photons/ s (0.1percent bandwidth at 8 keV). The radiation is relayed from the superbend source to a focus in the experimental hutch by a toroidal mirror. The focus spot is tailored bytwo pairs of adjustable slits, which serve as secondary source point. Inside the lead hutch, a pair of Kirkpatrick-Baez (KB) mirrors placed in a vacuum tank refocuses the secondary slit source onto the sample position. A new KB-bending mechanism with active temperature stabilization allows for more reproducible and stable mirror bending and thus mirror focusing. Focus spots around 1 um are routinely achieved and allow a variety of experiments, which have in common the need of spatial resolution. The effective spatial resolution (~;;0.2 mu m) is limited by a convolution of beam size, scan-stage resolution, and stage stability. A four-bounce monochromator consisting of two channel-cut Si(111) crystals placed between the secondary source and KB-mirrors allows for easy changes between white-beam and monochromatic experiments while maintaining a fixed beam position. High resolution stage scans are performed while recording a fluorescence emission signal or an x-ray diffraction signal coming from either a monochromatic or a white focused beam. The former allows for elemental mapping, whereas the latter is used to produce two-dimensional maps of crystal-phases, -orientation, -texture, and -strain/stress. Typically achieved strain resolution is in the order of 5x10-5 strain units. Accurate sample positioning in the x-ray focus spot is achieved with a commercial laser-triangulation unit. A Si-drift detector serves as a high-energy-resolution (~;;150 eV full width at half maximum) fluorescence detector. Fluorescence scans can be collected in continuous scan mode with up to 300 pixels/s scan speed. A charge coupled device area detector is utilized as diffraction detector. Diffraction can be performed in reflecting or transmitting geometry. Diffraction data are processed using XMAS, an in-house written software package for Laue and monochromatic microdiffraction analysis.

  19. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.2.2 Beamline 5.3.2.2 Print Tuesday, 20 October 2009 08:37 Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active

  20. General User Proposals (GUPs)

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Proposals (GUPs) Print General Users are granted beam time through a peer review proposal process. They may use beamlines and endstations provided by the ALS or the Participating Research Team (PRT) that operates the beamline. Before Submitting a Proposal Review the ALS Beamlines Directory to learn about the research capabilities of individual beamlines at the ALS. Contact the beamline scientist or the local contact listed in the tables, for additional information about the beamline. You can

  1. Beamline 29-ID

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    & Milestones IEX Advisory Committees FDR Beamline Information RSXS ARPES APS Ring Status Current APS Schedule Intermediate Energy X-Rays (29-ID): The Intermediate Energy...

  2. Beamline 29-ID

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    component; implementation of beamline controls and safety systems (cleanroom, FOE progress, FOE progress2) Fall 2012 FDR approval (October 15) Installation of...

  3. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  4. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  5. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  6. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  7. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  8. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

  9. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  10. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    9.0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  11. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    9.0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  12. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  13. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  14. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  15. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  16. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  17. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  18. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  19. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  20. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  1. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  2. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  3. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  4. Metrology and Tests Beamline at SOLEIL

    SciTech Connect (OSTI)

    Idir, Mourad; Mercere, Pascal; Moreno, Thierry; Delmotte, Aurelien

    2007-01-19

    The objectives of this project is to design and install at the SOLEIL synchrotron radiation source a calibration and metrology test facility for the R and D of optical components and detectors. We propose to build, on a bending magnet, three branches dedicated to VUV, soft x-ray and hard x-ray energy ranges. The beamline will cover an energy range from few eV to 28 keV and give access to white beam from the bending magnet. This installation will first address the needs of the SOLEIL experimental groups (Optics and Detectors) and will be used by a large community. This beamline will also be valuable as a general-purpose beamline to prepare, test and set up a wide range of experiments in the field of Astrophysics, laser plasma etc. A complementary important aspect of this installation is the realization of primary standard: the metrology beamline of SOLEIL could become the national primary standard source in collaboration with the Laboratoire National d'Essais (LNE) and help in the design and characterization of several diagnostics for the Megajoule Laser in Bordeaux in collaboration with the CEA DIF. The beamline has been designed to provide great flexibility. In this paper, we describe the beamline design, capabilities, and end station instrumentation.

  5. General User Proposals (GUPs)

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    General User Proposals (GUPs) Print General Users are granted beam time through a peer review proposal process. They may use beamlines and endstations provided by the ALS or the Participating Research Team (PRT) that operates the beamline. Before Submitting a Proposal Review the ALS Beamlines Directory to learn about the research capabilities of individual beamlines at the ALS. Contact the beamline scientist or the local contact listed in the tables, for additional information about the

  6. Solar energy education. Renewable energy activities for general science

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    (Technical Report) | SciTech Connect energy education. Renewable energy activities for general science Citation Details In-Document Search Title: Solar energy education. Renewable energy activities for general science × You are accessing a document from the Department of Energy's (DOE) SciTech Connect. This site is a product of DOE's Office of Scientific and Technical Information (OSTI) and is provided as a public service. Visit OSTI to utilize additional information resources in energy

  7. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  8. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  9. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  10. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  11. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  12. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  13. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  14. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  15. Hutch for CSX Beamlines

    ScienceCinema (OSTI)

    Ed Haas

    2013-07-17

    NSLS-II will produce x-rays 10,000 times brighter than NSLS. To keep people safe from intense x-rays in the new facility, special enclosures, called hutches, will surround particular sections of beamlines.

  16. G4beamline

    Energy Science and Technology Software Center (OSTI)

    2011-05-24

    G4beamline is a single-particle-tracking simulation code based on the Geant4 toolkit. It is specifically optimized for the realistic evaluation of beam lines. It is especially useful for evaluating future muon facilities.

  17. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL...

  18. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL...

  19. General Publications

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    General Publications Print ALS Strategic Plan 2015-19 cover image An updated version of the ALS Strategic Plan, covering the five-year period from 2015 to 2019. As in the 2014-18 version, Section I gives a brief synopsis on beamline and endstation projects. The science drivers behind these projects are explained in greater detail in Section II, and a very brief description of emerging plans for a ALS-U are in Section III. Soft X-ray Science Opportunities Using Diffraction-Limited Storage Rings A

  20. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  1. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  2. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  3. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  4. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  5. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  6. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  7. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  8. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  9. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  10. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  11. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  12. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  13. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  14. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  15. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  16. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  17. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  18. Beamline 4.0.3

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    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  19. Beamline 4.0.3

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    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  20. Beamline 4.2.2

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    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  1. Beamline 4.2.2

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    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  2. Beamline 4.2.2

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    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  3. Beamline 4.2.2

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    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  4. Beamline 5.0.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  5. Beamline 5.0.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  6. Beamline 5.0.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  7. Beamline 5.0.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  8. Beamline 5.0.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  9. Beamline 5.0.2

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    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  10. Beamline 5.0.2

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    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  11. Beamline 5.0.2

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    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  12. Beamline 5.0.2

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    0.2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  13. Beamline 5.0.2

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    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  14. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  15. Beamline 5.3.1

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    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  16. Beamline 5.3.1

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    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  17. Beamline 5.3.1

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    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  18. Beamline 5.3.1

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    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  19. Beamline 5.3.1

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    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  20. Beamline 5.4.3

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    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  1. Beamline 5.4.3

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    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  2. Beamline 5.4.3

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    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  3. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.5 (v) mrad Measured spot

  4. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.5 (v) mrad Measured spot

  5. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.5 (v) mrad Measured spot

  6. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.5 (v) mrad Measured spot

  7. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.5 (v) mrad Measured spot

  8. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.5 (v) mrad Measured spot

  9. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.5 (v) mrad Measured spot

  10. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  11. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  12. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  13. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  14. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  15. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  16. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  17. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  18. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  19. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  20. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format