National Library of Energy BETA

Sample records for general sciences beamlines

  1. SPOT Suite Transforms Beamline Science

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    SPOT Suite Transforms Beamline Science SPOT Suite Transforms Beamline Science SPOT Suite brings advanced algorithms, high performance computing and data management to the masses August 18, 2014 Contact: Linda Vu, +1 510 495 2402, lvu@lbl.gov als.jpg Advanced Light Source (ALS) at Berkeley Lab (Photo by Roy Kaltschmidt) Some mysteries of science can only be explained on a nanometer scale -even smaller than a single strand of human DNA, which is about 2.5 nanometers wide. At this scale, scientists

  2. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source...

  3. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION...

  4. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION...

  5. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION...

  6. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION...

  7. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE...

  8. Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    beamline long-term schedules can be found on the ALS Beamlines Directory. Photon Source Parameters Brightness curves for bend magnet, superbend, and insertion devices....

  9. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  10. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  11. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  12. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source...

  13. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE...

  14. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes...

  15. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes...

  16. Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Micromachining X-ray Lithography Micromachining I (XRLM1), Port 2A, 10 mrad (Updated) X-ray lithography beamline for microfabrication. Two mode of operation, "white" and...

  17. Beamlines & Facilities

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Imaging Group: Beamlines The X-ray Micrscopy and Imaging Group operates several beamlines and facilities. The bending magnet beamline (2-BM) entertaines 2 general user programs in...

  18. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION...

  19. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE...

  20. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline Scientific Applications SAXSWAXS Solution Scattering Fiber diffraction Anomalous SAXS Source characteristics Bending Magnet Port 6A Electron Beam energy 1.3 GeV Dipole...

  1. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    beamline Beamline Every NIF beam starts at the master oscillator. The low-energy beam is amplified in the preamplifier module and then in the power amplifier, the main amplifier, and again in the power amplifier before the beam is run through the switchyard and into the target chamber

  2. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes...

  3. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The GCPCC beamline utilizes 1.5 mrad of the output of a single-pole 7 Tesla super conducting wiggler. The x-rays are collimated vertically by a fixed radius cylindrical mirror, ...

  4. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lisa Bovenkamp CAMD SAXS Beamline Schedule Your browser does not appear to support JavaScript, but this page needs to use JavaScript to display correctly. You can visit the...

  5. The High Energy Materials Science Beamline (HEMS) at PETRA III

    SciTech Connect (OSTI)

    Schell, Norbert; King, Andrew; Beckmann, Felix; Ruhnau, Hans-Ulrich; Kirchhof, Rene; Kiehn, Ruediger; Mueller, Martin; Schreyer, Andreas

    2010-06-23

    The HEMS Beamline at the German high-brilliance synchrotron radiation storage ring PETRA III is fully tunable between 30 and 250 keV and optimized for sub-micrometer focusing. Approximately 70 % of the beamtime will be dedicated to Materials Research. Fundamental research will encompass metallurgy, physics and chemistry with first experiments planned for the investigation of the relationship between macroscopic and micro-structural properties of polycrystalline materials, grain-grain-interactions, and the development of smart materials or processes. For this purpose a 3D-microsctructure-mapper has been designed. Applied research for manufacturing process optimization will benefit from high flux in combination with ultra-fast detector systems allowing complex and highly dynamic in-situ studies of micro-structural transformations, e.g. during welding processes. The beamline infrastructure allows accommodation of large and heavy user provided equipment. Experiments targeting the industrial user community will be based on well established techniques with standardized evaluation, allowing full service measurements, e.g. for tomography and texture determination. The beamline consists of a five meter in-vacuum undulator, a general optics hutch, an in-house test facility and three independent experimental hutches working alternately, plus additional set-up and storage space for long-term experiments. HEMS is under commissioning as one of the first beamlines running at PETRA III.

  6. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  7. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    12.3.1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source...

  8. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open...

  9. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users....

  10. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV...

  11. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  12. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  13. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE...

  14. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes...

  15. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  16. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  17. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  18. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  19. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  20. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  1. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  2. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  3. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  4. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 10.3.2 Print Tuesday, 20 October 2009 09:15 Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7

  5. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: 17 keV transmission though...

  6. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through...

  7. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 3.1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission...

  8. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables

  9. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables

  10. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode.

  11. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode.

  12. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Beamline 6.1.2 Print Tuesday, 20 October 2009 08:41 Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE)

  13. The New Structural Materials Science Beamlines BL8A and 8B at Photon Factory

    SciTech Connect (OSTI)

    Nakao, A.; Sugiyama, H.; Koyama, A.; Watanabe, K.

    2010-06-23

    BL8A and 8B are new beamlines for structural materials science at Photon Factory. The primary characteristics of both beamlines are similar. The incident beam is monochromatized by the Si(111) double-flat crystal monochromator and focused at the sample position by a Rh-coated bent cylindrical quartz mirror. The Weissenberg-camera-type imaging-plate (IP) diffractometers were installed. The X-ray diffraction experiments for structural studies of strongly correlated materials, such as transition metals, molecular conductors, endohedral fullerenes, nano-materials, etc, are conducted at these stations.

  14. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Beamline 7.3.1 Print Thursday, 17 June 2010 12:09 Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations

  15. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Beamline 1.4.3 Print Tuesday, 20 October 2009 08:08 FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science,...

  16. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  17. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  18. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  19. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  20. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  1. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Beamline 8.0.1 Print Tuesday, 20 October 2009 08:51 Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250

  2. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION ...

  3. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic,...

  4. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION ...

  5. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION...

  6. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE...

  7. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE...

  8. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  9. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  10. Beamline 10.3.2

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    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  11. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  12. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    10.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  13. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  14. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  15. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  16. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  17. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  18. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  19. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at

  20. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at

  1. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Beamline 7.3.3 Print Tuesday, 20 October 2009 08:50 Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC

  2. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Beamline 7.3.3 Print Tuesday, 20 October 2009 08:50 Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC

  3. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 8.3.2 Print Tuesday, 20 October 2009 08:56 Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft

  4. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  5. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  6. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Bend Diagnostic beamline Note: This beamline is NOT open to general users. 1-2 keV W. Byrne (510) 486-7517 This e-mail address is being protected from spambots. You need...

  7. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  8. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  9. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  10. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  11. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  12. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  13. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  14. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  15. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  16. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  17. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  18. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  19. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  20. The life science X-ray scattering beamline at NSLS-II

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    DiFabio, Jonathan; Yang, Lin; Chodankar, Shirish; Pjerov, Sal; Jakoncic, Jean; Lucas, Michael; Krywka, Christina; Graziano, Vito

    2015-09-30

    We report the current development status of the High Brightness X-ray Scattering for Life Sciences (or Life Science X-ray Scattering, LiX) beamline at the NSLS-II facility of Brookhaven National Laboratory. This instrument will operate in the x-ray energy range of 2.1-18 keV, provide variable beam sizes from 1 micron to ~0.5 mm, and support user experiments in three scientific areas: (1) high-throughput solution scattering, in-line size exclusion chromatography and flow mixers-based time-resolved solution scattering of biological macro-molecules, (2) diffraction from single- and multi-layered lipid membranes, and (3) scattering-based scanning probe imaging of biological tissues. In order to satisfy the beammore » stability required for these experiments and to switch rapidly between different types of experiments, we have adopted a secondary source with refractive lenses for secondary focusing, a detector system consisting of three Pilatus detectors, and specialized experimental modules that can be quickly exchanged and each dedicated to a defined set of experiments. The construction of this beamline is on schedule for completion in September 2015. User experiments are expected to start in Spring 2016.« less

  1. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  2. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  3. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  4. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  5. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  6. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  7. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 9.3.1 Print Tuesday, 20 October 2009 09:03 Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm

  8. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  9. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  10. APS Beamline 6-ID-D

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    D Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-D Beamline 6-ID-D is operated by the Magnetic Materials Group in the X-ray Science...

  11. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 11.0.1 Print Tuesday, 20 October 2009 09:16 PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving

  12. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 11.0.1 Print Tuesday, 20 October 2009 09:16 PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving

  13. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated

  14. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.3.2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000

  15. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  16. Beamline 4.0.2

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    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  17. Beamline 4.0.2

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    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  18. Beamline 4.0.2

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    4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the

  19. Beamline 6.3.2

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    Beamline 6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at

  20. Beamline 6.3.2

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    Beamline 6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at

  1. Beamline 6.3.2

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    Beamline 6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at

  2. Beamline 6.3.2

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    Beamline 6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at

  3. Beamline 12.3.1

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    1 Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated

  4. Beamline 12.3.2

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    2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors

  5. Beamline 4.0.2

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    Beamline 4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole...

  6. Beamline 11.0.2

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    11.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  7. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  8. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  9. Beamline 11.0.2

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    11.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  10. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  11. Beamline 11.0.2

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    0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  12. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  13. Beamline 11.0.2

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    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  14. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  15. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  16. Beamline 11.0.2

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    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  17. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  18. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  19. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  20. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  1. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  2. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  3. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  4. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  5. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  6. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  7. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  8. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  9. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  10. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  11. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  12. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  13. Beamline 4.2.2

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    Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE ...

  14. Beamline 8.3.1

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    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational...

  15. Beamline 5.0.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes...

  16. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  18. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  19. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  20. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  1. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  2. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  3. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  4. Beamline 8.0.1

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    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  5. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  6. Beamline 8.0.1

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    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  7. Beamline 8.0.1

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    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  8. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  9. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  10. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  11. Beamline 8.0.1

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    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  12. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  13. Beamline 3.1

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    Beamline 3.1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is

  14. Beamline 5.4.1

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    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 -...

  15. Beamline 1.4.3

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    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  16. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  17. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  18. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  19. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  20. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  1. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  2. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  3. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  4. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  5. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  6. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  7. Beamline 1.4.4

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    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

  8. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  9. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  10. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  11. Beamline 1.4.4

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    Beamline 1.4.4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials...

  12. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials...

  13. Beamline 4.0.2

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    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet...

  14. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  15. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  16. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  17. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  18. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  19. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  20. Beamline 6.3.1

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    1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500

  1. Beamline 6.3.1

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    1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500

  2. Beamline 6.3.1

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    1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500

  3. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  4. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  5. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  6. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  7. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  8. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  9. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  10. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  11. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  12. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  13. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  14. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  15. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  16. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  17. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  18. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  19. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  20. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  1. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  2. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  3. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  4. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  5. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  6. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  7. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  8. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500

  9. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  10. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  11. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  12. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  13. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3)...

  14. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  15. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  16. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  17. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  18. Beamlines | Advanced Photon Source

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Beamlines Home Beamlines Directory Research Techniques Sectors Directory Status and Schedule Safety and Training Beamlines The Advanced Photon Source consists of 34...

  19. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION ... High pressure laser heating Experimental techniques Powder diffraction, high-pressure ...

  20. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes ...

  1. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational...

  2. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION...

  3. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational...

  4. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    20 October 2009 09:31 High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE...

  5. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm...

  6. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes...

  7. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range...

  8. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  9. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  10. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10