Sample records for gallium arsenide gaas

  1. Gallium Arsenide (GaAs) EDWARD D. PALIK

    E-Print Network [OSTI]

    Pulfrey, David L.

    constants of pure (semi-insulating) GaAs are derived from a number of papers including the far-infrared at. [4]; the near-IR work of Pikhtin and Yas'kov [5]; the calorim- etry work of Christensen et al. [6 reflection work of Philipp and Ehrenreich [9]; and the synchrotron transmission work of Cardona et al. [10

  2. Optical, electrical, and solar energy-conversion properties of gallium arsenide nanowire-array

    E-Print Network [OSTI]

    Zhou, Chongwu

    Optical, electrical, and solar energy-conversion properties of gallium arsenide nanowire, and will aid in the design and optimization of nanowire-based systems for solar energy-conversion applications, and the photoelectrochemical energy-conversion properties of GaAs nanowire arrays were evaluated in contact with one

  3. Inhalation developmental toxicology studies: Gallium arsenide in mice and rats

    SciTech Connect (OSTI)

    Mast, T.J.; Greenspan, B.J.; Dill, J.A.; Stoney, K.H.; Evanoff, J.J.; Rommereim, R.L.

    1990-12-01T23:59:59.000Z

    Gallium arsenide is a crystalline compound used extensively in the semiconductor industry. Workers preparing solar cells and gallium arsenide ingots and wafers are potentially at risk from the inhalation of gallium arsenide dust. The potential for gallium arsenide to cause developmental toxicity was assessed in Sprague- Dawley rats and CD-1 (Swiss) mice exposed to 0, 10, 37, or 75 mg/m{sup 3} gallium arsenide, 6 h/day, 7 days/week. Each of the four treatment groups consisted of 10 virgin females (for comparison), and {approx}30 positively mated rats or {approx}24 positively mated mice. Mice were exposed on 4--17 days of gestation (dg), and rats on 4--19 dg. The day of plug or sperm detection was designated as 0 dg. Body weights were obtained throughout the study period, and uterine and fetal body weights were obtained at sacrifice (rats, 20 dg; mice, 18 dg). Implants were enumerated and their status recorded. Live fetuses were sexed and examined for gross, visceral, skeletal, and soft-tissue craniofacial defects. Gallium and arsenic concentrations were determined in the maternal blood and uterine contents of the rats (3/group) at 7, 14, and 20 dg. 37 refs., 11 figs., 30 tabs.

  4. Process for forming pure silver ohmic contacts to N- and P-type gallium arsenide materials

    DOE Patents [OSTI]

    Hogan, S.J.

    1983-03-13T23:59:59.000Z

    Disclosed is an improved process for manufacturing gallium arsenide semiconductor devices having as its components a n-type gallium arsenide substrate layer and a p-type gallium arsenide diffused layer. The improved process comprises forming a pure silver ohmic contact to both the diffuse layer and the substrate layer wherein the n-type layer comprises a substantially low doping carrier concentration.

  5. Fabrication of optoelectronic microwave linear and ring resonators on a gallium arsenide substrate

    E-Print Network [OSTI]

    Yeh, Chun-Liang

    1993-01-01T23:59:59.000Z

    for the degree of MASTER OF SCIENCE August 1993 Major Subject: Electrical Engineering FABRICATION OF OPTOELECTRONIC MICROWAVE LINEAR AND RING RESONATORS ON A GALLIUM ARSENIDE SUBSTRATE A Thesis by CHUN-LIANG YEH Approved as to style and content by: Mark... and the first modes at 4. 87, 4. 89, 4. 91 GHz have been designed, simulated, and fabricated on a GaAs substrate. A microstrip ring resonator with 3/4 pm coupling gaps and the first mode at 3. 456 GHz also has been fabricated on GaAs. A reliable high yield...

  6. Structure and electrical characterization of gallium arsenide nanowires with different V/III ratio growth parameters

    SciTech Connect (OSTI)

    Muhammad, R.; Ahamad, R. [Sustainability Research Alliance, Universiti Teknologi Malaysia, 81310 Skudai, Johor (Malaysia); Ibrahim, Z.; Othaman, Z. [Physic Department, Faculty of Science, Universiti Teknologi Malaysia, 81310 Skudai, Johor (Malaysia)

    2014-03-05T23:59:59.000Z

    Gallium arsenide (GaAs) nanowires were grown vertically on GaAs(111)B substrate by gold-assisted using metal-organic chemical vapour deposition. Field-emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM) and conductivity atomic force microscopy (CAFM) analysis were carried out to investigate the effects of V/III ratio on structural properties and current-voltage changes in the wires. Results show that GaAs NWs grow preferably in the wurtzite crystal structure than zinc blende crystal structure with increasing V/III ratio. Additionally, CAFM studies have revealed that zincblende nanowires indicate ohmic characteristic compared to oscillation current occurred for wurtzite structures. The GaAs NWs with high quality structures are needed in solar cells technology for trapping energy that directly converts of sunlight into electricity with maximum capacity.

  7. Outdoor Performance of a Thin-Film Gallium-Arsenide Photovoltaic Module

    SciTech Connect (OSTI)

    Silverman, T. J.; Deceglie, M. G.; Marion, B.; Cowley, S.; Kayes, B.; Kurtz, S.

    2013-06-01T23:59:59.000Z

    We deployed a 855 cm2 thin-film, single-junction gallium arsenide (GaAs) photovoltaic (PV) module outdoors. Due to its fundamentally different cell technology compared to silicon (Si), the module responds differently to outdoor conditions. On average during the test, the GaAs module produced more power when its temperature was higher. We show that its maximum-power temperature coefficient, while actually negative, is several times smaller in magnitude than that of a Si module used for comparison. The positive correlation of power with temperature in GaAs is due to temperature-correlated changes in the incident spectrum. We show that a simple correction based on precipitable water vapor (PWV) brings the photocurrent temperature coefficient into agreement with that measured by other methods and predicted by theory. The low operating temperature and small temperature coefficient of GaAs give it an energy production advantage in warm weather.

  8. Process development for the fabrication of monolithic optoelectronic resonators on gallium arsenide substrates

    E-Print Network [OSTI]

    Fairchild, Brock Wilson

    1990-01-01T23:59:59.000Z

    with fairly good adhension prop- erties with gallium arsenide and gold. A layer of nickel was deposited on top of the AuGe to reduce the GaAs/AuGe interfacial strain that causes the AuGe to peal during plating. Good adhesion can be formed with GaAs when Au.... 57 LIST OF FIGURES FIGURE Page Typical ring resonator with coupled feed lines. Width/height ratio of photoresist in the gap region. Process steps for the fabrication of resonating structures. (a). Deposition of AuGe and nickel. (b). Spin...

  9. E-Print Network 3.0 - arsenide- gallium instrument Sample Search...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Materials Science 5 Formation of etch pits during carbon doping of gallium arsenide with carbon tetrachloride by metalorganic vapor-phase epitaxy Summary: Formation of etch pits...

  10. IEEE JOURNAL OF PHOTOVOLTAICS, VOL. 2, NO. 2, APRIL 2012 123 Gallium Arsenide Solar Cell Absorption

    E-Print Network [OSTI]

    Grandidier, Jonathan

    IEEE JOURNAL OF PHOTOVOLTAICS, VOL. 2, NO. 2, APRIL 2012 123 Gallium Arsenide Solar Cell Absorption--Gallium arsenide, nanospheres, photovoltaic systems, whispering gallery modes (WGMs). I. INTRODUCTION THE route as the active layer is thinned [2]. Thin-film photovoltaics offer the possibility to significantly reduce

  11. Fabrication of a gated gallium arsenide heterostructure resonant tunneling diode

    E-Print Network [OSTI]

    Kinard, William Brian

    1989-01-01T23:59:59.000Z

    , . ' 'CONTACT PAD' PLANAR I ZED POLYAM I DE RECTIFYI CONTACT N DBHS Pig. 2. f'utavvay vieiv of a gated gallium arsenide heterostructure resonant tunneling diode 1018 graded from 10 18 io" 10? (lightly doped) units=cm 8 ?graded from 10 to 18...FABRICATION OF A GATED GALLIL". tl ARSEXIDE HETEROSTRL CTL RF. RESONANT TF'XXELI'XG DIODE A Thesis bt ttrILLIAAI BRIA'. s KI'iARD Subnut ted to the Office of Graduate Studies of Texas AE;M Eniverstty tn partial fulfillment of the requirements...

  12. TESLA-FEL 2007-03 Application of low cost GaAs LED as neutron

    E-Print Network [OSTI]

    neutrons in unbiased Gallium Arsenide (GaAs) Light Emitting Diodes (LED) resulted in a reduction Keywords: COTS components, Displacement damage, Electron Linear Accelerator, GaAs Light emitting diode (LED) Gallium Arsenide (GaAs) light emitting diode (LED) for the assessment of integrated neutron fluence

  13. Two-photon photovoltaic effect in gallium arsenide Jeff Chiles,1

    E-Print Network [OSTI]

    Fathpour, Sasan

    Two-photon photovoltaic effect in gallium arsenide Jichi Ma,1 Jeff Chiles,1 Yagya D. Sharma,2 214669); published September 4, 2014 The two-photon photovoltaic effect is demonstrated in gallium; (230.0250) Optoelectronics; (040.5350) Photovoltaic; (130.4310) Nonlinear. http://dx.doi.org/10.1364/OL

  14. Investigation on properties of ultrafast switching in a bulk gallium arsenide avalanche semiconductor switch

    SciTech Connect (OSTI)

    Hu, Long, E-mail: hulong-1226@126.com [Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049 (China); Science and Technology on High Power Microwave Laboratory, Northwest Institute of Nuclear Technology, Xi'an 710024 (China); Su, Jiancang; Ding, Zhenjie; Hao, Qingsong; Yuan, Xuelin [Science and Technology on High Power Microwave Laboratory, Northwest Institute of Nuclear Technology, Xi'an 710024 (China)

    2014-03-07T23:59:59.000Z

    Properties of ultrafast switching in a bulk gallium arsenide (GaAs) avalanche semiconductor switch based on semi-insulating wafer, triggered by an optical pulse, were analyzed using physics-based numerical simulations. It has been demonstrated that when a voltage with amplitude of 5.2?kV is applied, after an exciting optical pulse with energy of 1??J arrival, the structure with thickness of 650??m reaches a high conductivity state within 110 ps. Carriers are created due to photons absorption, and electrons and holes drift to anode and cathode terminals, respectively. Static ionizing domains appear both at anode and cathode terminals, and create impact-generated carriers which contribute to the formation of electron-hole plasma along entire channel. When the electric field in plasma region increases above the critical value (?4?kV/cm) at which the electrons drift velocity peaks, a domain comes into being. An increase in carrier concentration due to avalanche multiplication in the domains reduces the domain width and results in the formation of an additional domain as soon as the field outside the domains increases above ?4?kV/cm. The formation and evolution of multiple powerfully avalanching domains observed in the simulations are the physical reasons of ultrafast switching. The switch exhibits delayed breakdown with the characteristics affected by biased electric field, current density, and optical pulse energy. The dependence of threshold energy of the exciting optical pulse on the biased electric field is discussed.

  15. arsenide gallium nitride: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lundberga,*, J. Lua , A Abstract The diffusion of indium and gallium in polycrystalline thin film Cu(In,Ga)Se2 layers has been with a larger number of vacancies, that facilitates...

  16. Self-aligned submicron gate length gallium arsenide MESFET 

    E-Print Network [OSTI]

    Huang, Hsien-Ching

    1987-01-01T23:59:59.000Z

    38 21. Proximity cap annealing . 22. Temperature profile of post implant anneal 46 47 23. 24. 25. 26. 27. 28. 29. 30. "Pits" or holes in GaAs post implant anneal without sacrificial cap Silicon monoxide source (bafile box) used.... 16(b)). The bottom resist layer is then further etched in the oxygen plasma to produce undercutting for the desire gate structure. The amount of undercut is determined by the desired length of the gate and is the width of the remaining resist...

  17. Monolithic series-connected gallium arsenide converter development

    SciTech Connect (OSTI)

    Spitzer, M.B.; McClelland, R.W.; Dingle, B.D.; Dingle, J.E.; Hill, D.S. (Kopin Corp., Taunton, MA (United States)); Rose, B.H. (Sandia National Labs., Albuquerque, NM (United States))

    1991-01-01T23:59:59.000Z

    We report the development of monolithic GaAs photovoltaic devices intended to convert light generated by a laser or other bright source to electricity. The converters described here can provide higher operating voltage than is possible using a single-junction converter, owing to use of a monolithic circuit that forms a planar series-connected string of single-junction sub-cells. This planar monolithic circuit is arranged to deliver the desired voltage and current during operation at the maximum power point. The paper describes two-, six-, and twelve-junction converters intended for illumination by a laser diode with a wavelength of 0.8 {mu}m. Design and characterization data are presented for optical power in the range of 100 mW to 1 W. The best conversion efficiency exceeds 50%. 9 refs., 4 figs., 2 tabs.

  18. Dynamics of formation of photoresponse in a detector structure made of gallium arsenide

    SciTech Connect (OSTI)

    Ayzenshtat, G. I., E-mail: ayzen@mail.tomsknet.ru; Lelekov, M. A.; Tolbanov, O. P. [Tomsk State University (Russian Federation)

    2008-04-15T23:59:59.000Z

    The influence of capture effects on the characteristics of detectors of the ionizing radiation based on semi-insulating gallium arsenide is considered. Generation of nonequilibrium electrons and holes along the entire thickness of the active region was performed under illumination with an infrared light-emitting diode with a wavelength of 0.9 {mu}m. In this case, the situation emerging in the device structure under the effect of X-ray radiation or a high-energy electron beam was simulated. It is shown that the variation in the shape of the output signal with time in this case is caused by variation in the electric field profile due to the capture of holes at deep centers in gallium arsenide. An absolutely different distribution of the electric field emerges in the structure under irradiation of a semitransparent cathode of the structure with a red light-emitting diode, emission of which penetrates into the active region for mere 1 {mu}m. In this case, the transformation of the electric field is caused by the capture of electrons. Under the prolonged effect of such radiation, a space-charge-limited current mode emerges in the device.

  19. Formation of etch pits during carbon doping of gallium arsenide with carbon tetrachloride by metalorganic vapor-phase epitaxy

    E-Print Network [OSTI]

    Li, Lian

    Formation of etch pits during carbon doping of gallium arsenide with carbon tetrachloride to examine the effects of carbon tetrachloride concentration and temperature on the morphology of carbon with increasing carbon tetrachloride concentration. Step bunching and pinning was observed at a IV/III ratio

  20. Organometallic vapor-phase homoepitaxy of gallium arsenide assisted by a downstream hydrogen afterglow plasma in the growth region

    E-Print Network [OSTI]

    Collins, George J.

    Organometallic vapor-phase homoepitaxy of gallium arsenide assisted by a downstream hydrogen 1991; accepted for publication 3 April 1992) hz situ generated arsenic hydrides are reacted downstream with trimethylgallium (TMGa), both in the presence of and in the absence of a downstream hydrogen afterglow plasma. The

  1. Simple intrinsic defects in GaAs : numerical supplement.

    SciTech Connect (OSTI)

    Schultz, Peter Andrew

    2012-04-01T23:59:59.000Z

    This Report presents numerical tables summarizing properties of intrinsic defects in gallium arsenide, GaAs, as computed by density functional theory. This Report serves as a numerical supplement to the results published in: P.A. Schultz and O.A. von Lilienfeld, 'Simple intrinsic defects in GaAs', Modelling Simul. Mater. Sci Eng., Vol. 17, 084007 (2009), and intended for use as reference tables for a defect physics package in device models. The numerical results for density functional theory calculations of properties of simple intrinsic defects in gallium arsenide are presented.

  2. The reaction of carbon tetrachloride with gallium arsenide ,,001... L. Li., S, Gan, B.-K. Han, H. Qi, and R. F. Hicksa)

    E-Print Network [OSTI]

    Li, Lian

    The reaction of carbon tetrachloride with gallium arsenide ,,001... L. Li., S, Gan, B.-K. Han, H, California 90095 Received 26 June 1997; accepted for publication 30 December 1997 Carbon tetrachloride of steps during the vapor-phase epitaxial growth of III­V compound semiconductors.3,4 Carbon tetrachloride

  3. An experiment to test the viability of a gallium-arsenide cathode in a SRF electron gun

    SciTech Connect (OSTI)

    Kewisch,J.; Ben-Zvi, I.; Rao, T.; Burrill, A.; Pate, D.; Wu, Q.; Todd, R.; Wang, E.; Bluem, H.; Holmes, D.; Schultheiss, T.

    2009-05-04T23:59:59.000Z

    Strained gallium arsenide cathodes are used in electron guns for the production of polarized electrons. In order to have a sufficient quantum efficiency lifetime of the cathode the vacuum in the gun must be 10{sup -11} Torr or better, so that the cathode is not destroyed by ion back bombardment or through contamination with residual gases. All successful polarized guns are DC guns, because such vacuum levels can not be obtained in normal conducting RF guns. A superconductive RF gun may provide a sufficient vacuum level due to cryo-pumping of the cavity walls. We report on the progress of our experiment to test such a gun with normal GaAs-Cs crystals.

  4. Sparse gallium arsenide to silicon metal waferbonding for heterogeneous monolithic microwave integrated circuits

    E-Print Network [OSTI]

    Bickford, Justin Robert

    2008-01-01T23:59:59.000Z

    lasers utilizing an InGaP etch-stop layer,” Semiconductor1992). Cirtic acid GaAs from InGaP: D. Arslan, A. Dehé, and1999). Hydrochloric acid InGaP from GaAs: J. R. Lothian, J.

  5. Nanoheteroepitaxy of gallium arsenide on strain-compliant silicon-germanium nanowires

    SciTech Connect (OSTI)

    Chin, Hock-Chun; Gong, Xiao; Yeo, Yee-Chia [Department of Electrical and Computer Engineering, National University of Singapore (NUS), Singapore 117576 (Singapore); Ng, Tien Khee; Loke, Wan Khai; Wicaksono, Satrio; Yoon, Soon Fatt [School of Electrical and Electronic Engineering, Nanyang Technological University (NTU), Nanyang Avenue, Singapore 639798 (Singapore); Wong, Choun Pei; Shen, Zexiang [Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University (NTU), Singapore 637371 (Singapore)

    2010-07-15T23:59:59.000Z

    Heterogeneous integration of high-quality GaAs on Si-based substrates using a selective migration-enhanced epitaxy (MEE) of GaAs on strain-compliant SiGe nanowires was demonstrated for the first time. The physics of compliance in nanoscale heterostructures was captured and studied using finite-element simulation. It is shown that nanostructures can provide additional substrate compliance for strain relief and therefore contribute to the formation of defect-free GaAs on SiGe. Extensive characterization using scanning electron microscopy and cross-sectional transmission electron microscopy was performed to illustrate the successful growth of GaAs on SiGe nanowire. Raman and Auger electron spectroscopy measurements further confirmed the quality of the GaAs grown and the high growth selectivity of the MEE process.

  6. May 20, 2010 Growing gallium arsenide in thick multilayer stacks could make a big

    E-Print Network [OSTI]

    Rogers, John A.

    of photovoltaics and optoelectronic devices such as near-infrared (NIR) imagers looks set to become significantly material systems such as gallium nitride and indium phosphide (Nature 465 329). "We can generate compound of substrates, including glass and plastic. In photovoltaics, we expect the cost reductions to be significant

  7. CO{sub 2} laser-based dispersion interferometer utilizing orientation-patterned gallium arsenide for plasma density measurements

    SciTech Connect (OSTI)

    Bamford, D. J.; Cummings, E. A.; Panasenko, D. [Physical Sciences Inc., 6652 Owens Drive, Pleasanton, California 94588 (United States)] [Physical Sciences Inc., 6652 Owens Drive, Pleasanton, California 94588 (United States); Fenner, D. B.; Hensley, J. M. [Physical Sciences Inc., 20 New England Business Center, Andover, Massachusetts 01810 (United States)] [Physical Sciences Inc., 20 New England Business Center, Andover, Massachusetts 01810 (United States); Boivin, R. L.; Carlstrom, T. N.; Van Zeeland, M. A. [General Atomics, P.O. Box 85608, San Diego, California 92186 (United States)] [General Atomics, P.O. Box 85608, San Diego, California 92186 (United States)

    2013-09-15T23:59:59.000Z

    A dispersion interferometer based on the second-harmonic generation of a carbon dioxide laser in orientation-patterned gallium arsenide has been developed for measuring electron density in plasmas. The interferometer includes two nonlinear optical crystals placed on opposite sides of the plasma. This instrument has been used to measure electron line densities in a pulsed radio-frequency generated argon plasma. A simple phase-extraction technique based on combining measurements from two successive pulses of the plasma has been used. The noise-equivalent line density was measured to be 1.7 × 10{sup 17} m{sup ?2} in a detection bandwidth of 950 kHz. One of the orientation-patterned crystals produced 13 mW of peak power at the second-harmonic wavelength from a carbon dioxide laser with 13 W of peak power. Two crystals arranged sequentially produced 58 mW of peak power at the second-harmonic wavelength from a carbon dioxide laser with 37 W of peak power.

  8. Surface Science 415 (1998) 2936 Structural studies of sulfur-passivated GaAs (100)

    E-Print Network [OSTI]

    Zhang, Yanchao

    1998-01-01T23:59:59.000Z

    . Keywords: Atomic force microscopy; Gallium arsenide; Low-energy electron diffraction; Roughness; SulfurSurface Science 415 (1998) 29­36 Structural studies of sulfur-passivated GaAs (100) surfaces Abstract We present the results of Auger electron spectroscopy (AES), low-energy electron diffraction (LEED

  9. Gallium arsenide-based ternary compounds and multi-band-gap solar cell research

    SciTech Connect (OSTI)

    Vernon, S. (Spire Corp., Bedford, MA (United States))

    1993-02-01T23:59:59.000Z

    Aim of this contract is the achievement of a high-efficiency, low-cost solar cell. The basic approach to the problem is centered upon the heteroepitaxial growth of a III-V compound material onto a single-crystal silicon wafer. The growth technique employed is metalorganic chemical vapor deposition. The silicon wafer may serve as a mechanical substrate and ohmic contact for a single-junction device, or may contain a p-n junction of its own and form the bottom cell of a two junction tandem solar cell structure. The III-V material for the single-junction case is GaAs and for the two-junction case is either GaAlAs or GaAsP, either material having the proper composition to yield a band gap of approximately 1.7 eV. Results achieved in this contract include the following: (1) a 17.6% efficient GaAs-on-Si solar cell; (2) an 18.5% efficient GaAs-on-Si concentrator solar cell at 400 suns; (3) a 24.8% efficient GaAs-on-GaAs solar cell; (4) a 28.7% efficient GaAs-on-GaAs concentrator solar cell at 200 suns; (5) measurement of the effects of dislocation density and emitter doping on GaAs cells; and (6) improvements in the growth process to achieve reproducible thin AlGaAs window layers with low recombination velocities and environmental stability.

  10. Analysis of gallium arsenide deposition in a horizontal chemical vapor deposition reactor using massively parallel computations

    SciTech Connect (OSTI)

    Salinger, A.G.; Shadid, J.N.; Hutchinson, S.A. [and others

    1998-01-01T23:59:59.000Z

    A numerical analysis of the deposition of gallium from trimethylgallium (TMG) and arsine in a horizontal CVD reactor with tilted susceptor and a three inch diameter rotating substrate is performed. The three-dimensional model includes complete coupling between fluid mechanics, heat transfer, and species transport, and is solved using an unstructured finite element discretization on a massively parallel computer. The effects of three operating parameters (the disk rotation rate, inlet TMG fraction, and inlet velocity) and two design parameters (the tilt angle of the reactor base and the reactor width) on the growth rate and uniformity are presented. The nonlinear dependence of the growth rate uniformity on the key operating parameters is discussed in detail. Efficient and robust algorithms for massively parallel reacting flow simulations, as incorporated into our analysis code MPSalsa, make detailed analysis of this complicated system feasible.

  11. Ab initio cluster calculations of hydrogenated GaAs,,001... surfaces Chemical Engineering Department, University of California, Los Angeles, California 90095-1592

    E-Print Network [OSTI]

    Li, Lian

    Ab initio cluster calculations of hydrogenated GaAs,,001... surfaces Q. Fu Chemical Engineering Engineering Department, University of California, Los Angeles, California 90095-1592 Received 11 November 1999 Hydrogen adsorption on the 2 4 and 4 2 reconstructions of gallium arsenide 001 has been studied by internal

  12. The development of integrated chemical microsensors in GaAs

    SciTech Connect (OSTI)

    CASALNUOVO,STEPHEN A.; ASON,GREGORY CHARLES; HELLER,EDWIN J.; HIETALA,VINCENT M.; BACA,ALBERT G.; HIETALA,S.L.

    1999-11-01T23:59:59.000Z

    Monolithic, integrated acoustic wave chemical microsensors are being developed on gallium arsenide (GaAs) substrates. With this approach, arrays of microsensors and the high frequency electronic components needed to operate them reside on a single substrate, increasing the range of detectable analytes, reducing overall system size, minimizing systematic errors, and simplifying assembly and packaging. GaAs is employed because it is both piezoelectric, a property required to produce the acoustic wave devices, and a semiconductor with a mature microelectronics fabrication technology. Many aspects of integrated GaAs chemical sensors have been investigated, including: surface acoustic wave (SAW) sensors; monolithic SAW delay line oscillators; GaAs application specific integrated circuits (ASIC) for sensor operation; a hybrid sensor array utilizing these ASICS; and the fully monolithic, integrated SAW array. Details of the design, fabrication, and performance of these devices are discussed. In addition, the ability to produce heteroepitaxial layers of GaAs and aluminum gallium arsenide (AlGaAs) makes possible micromachined membrane sensors with improved sensitivity compared to conventional SAW sensors. Micromachining techniques for fabricating flexural plate wave (FPW) and thickness shear mode (TSM) microsensors on thin GaAs membranes are presented and GaAs FPW delay line and TSM resonator performance is described.

  13. Thin films of gallium arsenide on low-cost substrates. Final technical report, July 5, 1976-December 5, 1978

    SciTech Connect (OSTI)

    Ruth, R.P.; Dapkus, P.D.; Dupuis, R.D.; Johnson, R.E.; Moudy, L.A.; Yang, J.J.; Yingling, R.D.

    1980-03-01T23:59:59.000Z

    The MO-CVD technique was applied to the growth of thin films of GaAs and GaAl As on inexpensive polycrystalline or amorphous substrate materials (primarily glasses and metals) for use in fabrication of large-area low-cost photovoltaic device structures. Trimethylgallium, arsine, and trimethylaluminum are mixed in appropriate concentrations at room temperature in the gaseous state and pyrolyzed at the substrate, which is heated in a vertical reactor chamber to temperatures of 700 to 750/sup 0/C, to produce the desired film composition and properties. Studies of the properties of grain boundaries in polycrystalline GaAs films by the use of transport measurements as a function of temperature indicated that the grain boundary regions are depleted of majority carriers by a large density of neutral traps at the grain boundary interface, causing a barrier to majority carrier flow in the material. Schottky-barrier solar cells of approx. 3 percent efficiency (simulated AM0 illumination, no AR coating) were demonstrated on thin-film polycrystalline GaAs n/n/sup +/ structures on Mo sheet, Mo film/glass, and graphite substrates. Substantial enhancement of average grain size in polycrystalline MO-CVD GaAs films on Mo sheet was obtained by the addition of HCl to the growth atmosphere during deposition. Extensive investigation of polycrystalline thin-film p-n junctions indicated that the forward voltage of such devices is apparently limited to 0.5 to 0.6V. A laboratory-type deposition apparatus for the formation of TiO/sub 2/ antireflection (AR) coatings by pyrolysis of titanium isopropoxide was assembled and tested. Detailed analyses were made of the materials and labor costs involved in the laboratory-scale fabrication of MO-CVD thin-film GaAs solar cells. Details are presented. (WHK)

  14. E-Print Network 3.0 - arsenide x-ray imaging Sample Search Results

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Physics 4 Formation of etch pits during carbon doping of gallium arsenide with carbon tetrachloride by metalorganic vapor-phase epitaxy Summary: assessed using high-...

  15. Gallium surface diffusion on GaAs (001) surfaces measured by crystallization dynamics of Ga droplets

    SciTech Connect (OSTI)

    Bietti, Sergio, E-mail: sergio.bietti@mater.unimib.it; Somaschini, Claudio; Esposito, Luca; Sanguinetti, Stefano [L–NESS and Dipartimento di Scienza dei Materiali, Università di Milano Bicocca, Via Cozzi 55, I–20125 Milano (Italy); Fedorov, Alexey [L–NESS and CNR–IFN, via Anzani 42, I-22100 Como (Italy)

    2014-09-21T23:59:59.000Z

    We present accurate measurements of Ga cation surface diffusion on GaAs surfaces. The measurement method relies on atomic force microscopy measurement of the morphology of nano–disks that evolve, under group V supply, from nanoscale group III droplets, earlier deposited on the substrate surface. The dependence of the radius of such nano-droplets on crystallization conditions gives direct access to Ga diffusion length. We found an activation energy for Ga on GaAs(001) diffusion E{sub A}=1.31±0.15 eV, a diffusivity prefactor of D{sub 0}?=?0.53(×2.1±1) cm{sup 2} s{sup ?1} that we compare with the values present in literature. The obtained results permit to better understand the fundamental physics governing the motion of group III ad–atoms on III–V crystal surfaces and the fabrication of designable nanostructures.

  16. Low-temperature synthesis of gallium nitride thin films using electron cyclotron resonance plasma assisted pulsed laser deposition from a GaAs target

    SciTech Connect (OSTI)

    Sun, J.; Wu, A.M.; Xu, N.; Ying, Z.F.; Shen, X.K.; Dong, Z.B.; Wu, J.D.; Shi, L.Q. [State Key Laboratory for Advanced Photonic Materials and Devices, Department of Optical Science and Engineering, Fudan University, Shanghai 200433 (China); Institute of Modern Physics, Fudan University, Shanghai 200433 (China)

    2005-11-15T23:59:59.000Z

    Using reactive pulsed laser deposition assisted by electron cyclotron resonance (ECR) plasma, we have synthesized GaN thin films from a polycrystalline GaAs target at low temperatures. This was achieved by ablating the GaAs target in the reactive environment of a nitrogen plasma generated from ECR microwave discharge in pure nitrogen gas and depositing the films with concurrent bombardment by the low-energy nitrogen plasma stream. High-energy ion backscattering spectroscopy analysis shows that the synthesized films are gallium rich. Characterizations by x-ray photoelectron spectroscopy and Fourier transform infrared spectroscopy confirm the presence of GaN bonds in the films. The recorded absorption spectrum also reveals GaN stretching mode characteristic of the hexagonal GaN phase. The synthesized GaN films are transparent in the visible region and have a band gap of 3.38 eV. Optical emission from the plume during film deposition reveals that the plume created by pulsed laser ablation of the GaAs target consists mainly of monoatomic atoms and ions of gallium and arsenic. Mechanisms responsible for the formation of GaN molecules and the growth of GaN films are also discussed.

  17. Narrow energy band gap gallium arsenide nitride semi-conductors and an ion-cut-synthesis method for producing the same

    DOE Patents [OSTI]

    Weng, Xiaojun; Goldman, Rachel S.

    2006-06-06T23:59:59.000Z

    A method for forming a semi-conductor material is provided that comprises forming a donor substrate constructed of GaAs, providing a receiver substrate, implanting nitrogen into the donor substrate to form an implanted layer comprising GaAs and nitrogen. The implanted layer is bonded to the receiver substrate and annealed to form GaAsN and nitrogen micro-blisters in the implanted layer. The micro-blisters allow the implanted layer to be cleaved from the donor substrate.

  18. Gallium arsenide-based ternary compounds and multi-band-gap solar cell research. Annual subcontract report, 15 April 1988--14 June 1990

    SciTech Connect (OSTI)

    Vernon, S. [Spire Corp., Bedford, MA (United States)

    1993-02-01T23:59:59.000Z

    Aim of this contract is the achievement of a high-efficiency, low-cost solar cell. The basic approach to the problem is centered upon the heteroepitaxial growth of a III-V compound material onto a single-crystal silicon wafer. The growth technique employed is metalorganic chemical vapor deposition. The silicon wafer may serve as a mechanical substrate and ohmic contact for a single-junction device, or may contain a p-n junction of its own and form the bottom cell of a two junction tandem solar cell structure. The III-V material for the single-junction case is GaAs and for the two-junction case is either GaAlAs or GaAsP, either material having the proper composition to yield a band gap of approximately 1.7 eV. Results achieved in this contract include the following: (1) a 17.6% efficient GaAs-on-Si solar cell; (2) an 18.5% efficient GaAs-on-Si concentrator solar cell at 400 suns; (3) a 24.8% efficient GaAs-on-GaAs solar cell; (4) a 28.7% efficient GaAs-on-GaAs concentrator solar cell at 200 suns; (5) measurement of the effects of dislocation density and emitter doping on GaAs cells; and (6) improvements in the growth process to achieve reproducible thin AlGaAs window layers with low recombination velocities and environmental stability.

  19. Preparation of silicon substrates for gallium-arsenide solar cells by electron-beam-pulse processing. Annual technical report, March 15, 1980-March 15, 1981

    SciTech Connect (OSTI)

    Tobin, S.P.

    1981-05-01T23:59:59.000Z

    In the past year a process has been developed for creating high-quality epitaxial layers of germanium on silicon substrates using rapid heating and cooling with a pulsed electron beam. This single-crystal germanium coating is the key to the production of high efficiency GaAs solar cells on low-cost silicon substrates in an economical manner. Thin (less than or equal to 1 ..mu..m) layers of Ge have been deposited on Si wafers by chemical vapor deposition (CVD) in single-crystal form or by vacuum evaporation in amorphous or polycrystalline form. The CVD films have given the best results, with good crystallinity and electrical properties as deposited. A persistent problem with surface roughness in the as-deposited films has been overcome by pulsed electron beam melting of the near-surface region in time periods on the order of a microsecond. The brief molten period smooths the surface features without compromising the crystallinity, electrical properties, or interfacial abruptness of the Ge film. These layers are of a quality suitable for further evaluation by GaAs growth and cell processing in the next phase of the program. Pulsed electron beam processing also serves a vital function for the evaporated Ge films, which are melted by the beam and recrystallized on the Si substrates, epitaxial single crystal Ge layers result from amorphous or polycrystalline starting films. To date results have not been as satisfactory as for CVD films; contamination from several sources has been identified as a problem. Many of these sources have been eliminated, so that a decision on the intrinsic limitations of the evaporated film approach should be made in the near future.

  20. Gallium arsenide-based ternary compounds and multi-band-gap solar cell research. Final subcontract report, 1 April 1988--31 March 1990

    SciTech Connect (OSTI)

    Vernon, S. [Spire Corp., Bedford, MA (United States)

    1993-07-01T23:59:59.000Z

    This report describes work to achieve a high-efficiency, low-cost solar cell. The basic approach to the problem is centered upon the heteroepitaxial growth of a III-V compound material onto a single-crystal silicon wafer. The growth technique employed throughout this work is metal-organic chemical vapor deposition. The silicon wafer may serve as a mechanical substrate and ohmic contact for a single-junction device, or it may contain a p-n junction of its own and form the bottom cell of a two-junction tandem solar cell structure. The III-V material for the single-junction case is GaAs, and for the two-junction case it is either GaAlAs or GaAsP, either material having the proper composition to yield a band gap of approximately 1.7 eV. Results achieved in this contract include (1) a 17.6%-efficient GaAs-on-Si solar cell; (2) an 18.5%-efficient GaAs-on-Si concentrator solar cell at 400 suns; (3) a 24.8%-efficient GaAs-on-GaAs solar cell; (4) a 28.7%-efficient GaAs-on-GaAs concentrator solar cell at 200 suns; (5) the measurement of the effects of dislocation density and emitter doping on GaAs cells; and (6) improvements in the growth process to achieve reproducible thin AlGaAs window layers with low recombination velocities and environmental stability.

  1. Velocity distribution function of sputtered gallium atoms during inductively coupled argon plasma treatment of a GaAs surface

    SciTech Connect (OSTI)

    Despiau-Pujo, Emilie; Chabert, Pascal; Ramos, Raphaeel; Cunge, Gilles; Sadeghi, Nader [Laboratoire de Physique des Plasmas, Ecole Polytechnique, 91128 Palaiseau (France); Laboratoire des Technologies de la Microelectronique, CNRS, 38054 Grenoble (France)

    2009-03-15T23:59:59.000Z

    A GaN laser diode at 403.3 nm is used to measure the velocity distribution function (vdf) of Ga atoms sputtered from a radio-frequency biased GaAs substrate in a low pressure inductively coupled plasma (ICP) argon discharge. To investigate both perpendicular (V{sub z} normal to wafer) and longitudinal (V{sub x} parallel to wafer) velocity components, laser induced fluorescence (LIF) measurements are performed in the z direction and atomic absorption spectroscopy (AAS) in the x direction. The longitudinal vdf of Ga sputtered atoms is very close to a Lorentzian function with V{sub x} comprised between 0 and 7500 m s{sup -1}, while the perpendicular velocities V{sub z} can reach 10 000 m s{sup -1}. Experimental results are compared to molecular dynamics (MD) simulations of Ar{sup +} ion sputtering of GaAs under 200 eV bombardment. MD predictions and experiments are in fairly good agreement, which confirms the existence of products sputtered from the surface with kinetic energies larger than 10 eV. In etching processes dominated by physical bombardment, these energetic atoms could alter passivation layers on sidewalls and be responsible for defects observed in nanodevices. The best fit of the Doppler-broadened LIF and AAS profiles with the vdfs predicted by sputtering theory allows one to estimate the surface binding energy of Ga atoms in GaAs, E{sub b}, to be around 3 eV.

  2. Thermal influence on charge carrier transport in solar cells based on GaAs PN junctions

    SciTech Connect (OSTI)

    Osses-Márquez, Juan; Calderón-Muñoz, Williams R., E-mail: wicalder@ing.uchile.cl [Department of Mechanical Engineering, University of Chile, Beauchef 850, Santiago (Chile)

    2014-10-21T23:59:59.000Z

    The electron and hole one-dimensional transport in a solar cell based on a Gallium Arsenide (GaAs) PN junction and its dependency with electron and lattice temperatures are studied here. Electrons and heat transport are treated on an equal footing, and a cell operating at high temperatures using concentrators is considered. The equations of a two-temperature hydrodynamic model are written in terms of asymptotic expansions for the dependent variables with the electron Reynolds number as a perturbation parameter. The dependency of the electron and hole densities through the junction with the temperature is analyzed solving the steady-state model at low Reynolds numbers. Lattice temperature distribution throughout the device is obtained considering the change of kinetic energy of electrons due to interactions with the lattice and heat absorbed from sunlight. In terms of performance, higher values of power output are obtained with low lattice temperature and hot energy carriers. This modeling contributes to improve the design of heat exchange devices and thermal management strategies in photovoltaic technologies.

  3. Fabrication of a gated gallium arsenide heterostructure resonant tunneling diode 

    E-Print Network [OSTI]

    Kinard, William Brian

    1989-01-01T23:59:59.000Z

    ) William Brian Kinard, B. S, Texas A&M University Chair of Advisory Committee: Mark H. Weichold The objective of this research was to design and fabricate a device capable of electrically contrulhng current through a vertical resonant tunneling diode.... Addi- tionally, this modulation of current must not aB'ect the normal cperation of the resonant tunneling diode such as shifting resonant bias. Device arrays of various sizes were successfully 1'abricated for the first time utilizing unique...

  4. Broadband electrooptic modulators based on gallium arsenide materials

    E-Print Network [OSTI]

    Shamir, Orit A

    2012-01-01T23:59:59.000Z

    Optical Arbitrary Waveform Generation (OAWG) combines frequency combs and frequency-by- frequency pulse shapers to synthesize optical waveforms. The OAWG technique has a wide variety of applications, ranging from high ...

  5. GaAs Nanowire Array Solar Cells with Axial p-i-n Junctions Maoqing Yao, Ningfeng Huang, Sen Cong, Chun-Yung Chi, M. Ashkan Seyedi, Yen-Ting Lin, Yu Cao,

    E-Print Network [OSTI]

    Zhou, Chongwu

    for future low-cost, high-efficiency photovoltaics. KEYWORDS: Nanowires, solar cells, gallium arsenide, axial.58% efficiency. Simulations show that axial junctions are more tolerant to doping variation than radial junctions and shallow junctions are essential for a high extraction efficiency. Our approach opens up great opportunity

  6. Lattice distortion in single crystal rare-earth arsenide/GaAs nanocomposites

    SciTech Connect (OSTI)

    Young, A. J. [Materials Department, University of California, Santa Barbara, California 93106-5050 (United States); Schultz, B. D. [Department of Electrical and Computer Engineering, University of California, Santa Barbara, California 93106-9560 (United States); Palmstrøm, C. J., E-mail: cpalmstrom@ece.ucsb.edu [Materials Department, University of California, Santa Barbara, California 93106-5050 (United States); Department of Electrical and Computer Engineering, University of California, Santa Barbara, California 93106-9560 (United States)

    2014-02-17T23:59:59.000Z

    Epitaxial single crystal nanocomposites comprised of rare-earth arsenide nanoparticles embedded in GaAs (001) layers produce a larger change in lattice parameter than expected from the lattice parameters of relaxed films. Despite similar cubic structures and lattice parameters, elongation of the interfacial bond length between the two materials induces additional strain causing an expansion in the nanocomposite lattice. The interface bond length is material dependent with an average atomic layer spacing at the ErAs:GaAs interface of 1.9?Å while the spacing at the ScAs:GaAs interface is only 1.4?Å. Implications for lattice matching various single crystal epitaxial nanostructures in semiconductors are discussed.

  7. A Terminal Molybdenum Arsenide Complex Synthesized from Yellow Arsenic

    E-Print Network [OSTI]

    Curley, John J.

    A terminal molybdenum arsenide complex is synthesized in one step from the reactive As4 molecule. The properties of this complex with its arsenic atom ligand are discussed in relation to the analogous nitride and phosphide ...

  8. Fabrication of an optically driven 10 GHz ring resonator on a gallium arsenide substrate

    E-Print Network [OSTI]

    McGregor, Douglas Scott

    1989-01-01T23:59:59.000Z

    /D converters, optical detectors, dc to rf converters, and millimeter-wave or microwave generators. Photoconductors can be easily integrated with microelectronic devices as well as microwave circuits. Recently, an optically excited photoconductive switch... is the barrier height and y, is the electron affinity for the semiconductor. Current flow at a metal-semiconductor barrier is due mainly to majority carriers. The four major current transport methods are thermionic emission over the barrier, quantum...

  9. Sparse gallium arsenide to silicon metal waferbonding for heterogeneous monolithic microwave integrated circuits

    E-Print Network [OSTI]

    Bickford, Justin Robert

    2008-01-01T23:59:59.000Z

    is limited by the cold-wall chamber design and the porousrepeatability. The cold-wall chamber design also limits the

  10. Sparse gallium arsenide to silicon metal waferbonding for heterogeneous monolithic microwave integrated circuits

    E-Print Network [OSTI]

    Bickford, Justin Robert

    2008-01-01T23:59:59.000Z

    and Applications, edited by T. M. Tritt, ( Kluwer Academic /and Applications, edited by T. M. Tritt, ( Kluwer Academic /and Applications, edited by T. M. Tritt, ( Kluwer Academic /

  11. Sparse gallium arsenide to silicon metal waferbonding for heterogeneous monolithic microwave integrated circuits

    E-Print Network [OSTI]

    Bickford, Justin Robert

    2008-01-01T23:59:59.000Z

    process: after sample pair wax wetting. .. 311 Figureprocess: after PMGI and wax dissolution and composite1. Picture of an example wax wetting two microscope slide

  12. Sparse gallium arsenide to silicon metal waferbonding for heterogeneous monolithic microwave integrated circuits

    E-Print Network [OSTI]

    Bickford, Justin Robert

    2008-01-01T23:59:59.000Z

    4240 OUTPUT 708;"B12X" ! turns TEG-1 bubbler off 4250 OUTPUT708;"B8X" ! turns TEG-2,3 bubbler off 4260 OUTPUT 708;"OUTPUT 709;"B11X" ! turns TEG-1 out off OUTPUT 709;"B7X" !

  13. The Hall mobility measurement of Liquid Phase Epitaxy grown aluminum gallium arsenide

    E-Print Network [OSTI]

    Choi, Young-Shig

    1986-01-01T23:59:59.000Z

    -type AJGaAs mobility as a function of doping concentration with temperature as a, parameter. . 51 CHAPTER I INTRODUCTION AI?Ga& ?As (x is the mole fraction of Al) has been employed to fabricate discrete Light Emitting Diodes (LED) and Laser Diodes... grown l&y 1. PE are the lasers and light, -emitting diodes, 2, 31. 10 One limitation of the LPE technique is the difficulty of growing layers that differ in lattice constant by more than lv/& from the substrate. Lattice mismatch, occuring whenever...

  14. Fabrication of optoelectronic microwave linear and ring resonators on a gallium arsenide substrate 

    E-Print Network [OSTI]

    Yeh, Chun-Liang

    1993-01-01T23:59:59.000Z

    the frequency ~, = urn' +amoco) have been observed. In the third part of the optical tests, the degenerate parametric amplification of an optical signal RF modulated at the first mode of the resonator with a microwave pumping LO at second mode... for the ring resonator. 77 46 Mixing Test Setup. 79 47 The sum signal IF, for the linear resonator with 10 prn coupling gap. The RF signal is at 4. 875 GHz and the I, O signal is at 4. 750 GHz, where the IF, signal (users = ans + uiqo) is detected at 9. 624...

  15. Gallium Arsenide-Based Readout Electronics Thomas J. Cunningham and Eric R. Fossum

    E-Print Network [OSTI]

    Fossum, Eric R.

    susceptible to radiation and hot carrier damage than are MaS-based structures. This should result in increased;among these has been the construction of optical emitters such as LEDs and lasers, since efficient

  16. Sparse gallium arsenide to silicon metal waferbonding for heterogeneous monolithic microwave integrated circuits

    E-Print Network [OSTI]

    Bickford, Justin Robert

    2008-01-01T23:59:59.000Z

    affect the Ni heater photolithography step, but with properstep impulse current is driven through a monolithic heater

  17. Electrospun Gallium Nitride Nanofibers

    SciTech Connect (OSTI)

    Melendez, Anamaris; Morales, Kristle; Ramos, Idalia [University of Puerto Rico at Humacao, Humacao (Puerto Rico); Campo, Eva [Centre Nacional de Microelectronica, Barcelona (Spain); Santiago, Jorge J. [University of Pennsylvania, Philadelphia (United States)

    2009-04-19T23:59:59.000Z

    The high thermal conductivity and wide bandgap of gallium nitride (GaN) are desirable characteristics in optoelectronics and sensing applications. In comparison to thin films and powders, in the nanofiber morphology the sensitivity of GaN is expected to increase as the exposed area (proportional to the length) increases. In this work we present electrospinning as a novel technique in the fabrication of GaN nanofibers. Electrospinning, invented in the 1930s, is a simple, inexpensive, and rapid technique to produce microscopically long ultrafine fibers. GaN nanofibers are produced using gallium nitrate and dimethyl-acetamide as precursors. After electrospinning, thermal decomposition under an inert atmosphere is used to pyrolyze the polymer. To complete the preparation, the nanofibers are sintered in a tube furnace under a NH{sub 3} flow. Both scanning electron microscopy and profilometry show that the process produces continuous and uniform fibers with diameters ranging from 20 to a few hundred nanometers, and lengths of up to a few centimeters. X-ray diffraction (XRD) analysis shows the development of GaN nanofibers with hexagonal wurtzite structure. Future work includes additional characterization using transmission electron microscopy and XRD to understand the role of precursors and nitridation in nanofiber synthesis, and the use of single nanofibers for the construction of optical and gas sensing devices.

  18. Gallium Safety in the Laboratory

    SciTech Connect (OSTI)

    Cadwallader, L.C.

    2003-05-07T23:59:59.000Z

    A university laboratory experiment for the US Department of Energy magnetic fusion research program required a simulant for liquid lithium. The simulant choices were narrowed to liquid gallium and galinstan (Ga-In-Sn) alloy. Safety information on liquid gallium and galinstan were compiled, and the choice was made to use galinstan. A laboratory safety walkthrough was performed in the fall of 2002 to support the galinstan experiment. The experiment has been operating successfully since early 2002.

  19. Potential effects of gallium on cladding materials

    SciTech Connect (OSTI)

    Wilson, D.F.; Beahm, E.C.; Besmann, T.M.; DeVan, J.H.; DiStefano, J.R.; Gat, U.; Greene, S.R.; Rittenhouse, P.L.; Worley, B.A.

    1997-10-01T23:59:59.000Z

    This paper identifies and examines issues concerning the incorporation of gallium in weapons derived plutonium in light water reactor (LWR) MOX fuels. Particular attention is given to the more likely effects of the gallium on the behavior of the cladding material. The chemistry of weapons grade (WG) MOX, including possible consequences of gallium within plutonium agglomerates, was assessed. Based on the calculated oxidation potentials of MOX fuel, the effect that gallium may have on reactions involving fission products and possible impact on cladding performance were postulated. Gallium transport mechanisms are discussed. With an understanding of oxidation potentials and assumptions of mechanisms for gallium transport, possible effects of gallium on corrosion of cladding were evaluated. Potential and unresolved issues and suggested research and development (R and D) required to provide missing information are presented.

  20. P-type gallium nitride

    DOE Patents [OSTI]

    Rubin, Michael (Berkeley, CA); Newman, Nathan (Montara, CA); Fu, Tracy (Berkeley, CA); Ross, Jennifer (Pleasanton, CA); Chan, James (Berkeley, CA)

    1997-01-01T23:59:59.000Z

    Several methods have been found to make p-type gallium nitride. P-type gallium nitride has long been sought for electronic devices. N-type gallium nitride is readily available. Discovery of p-type gallium nitride and the methods for making it will enable its use in ultraviolet and blue light-emitting diodes and lasers. pGaN will further enable blue photocathode elements to be made. Molecular beam epitaxy on substrates held at the proper temperatures, assisted by a nitrogen beam of the proper energy produced several types of p-type GaN with hole concentrations of about 5.times.10.sup.11 /cm.sup.3 and hole mobilities of about 500 cm.sup.2 /V-sec, measured at 250.degree. K. P-type GaN can be formed of unintentionally-doped material or can be doped with magnesium by diffusion, ion implantation, or co-evaporation. When applicable, the nitrogen can be substituted with other group III elements such as Al.

  1. P-type gallium nitride

    DOE Patents [OSTI]

    Rubin, M.; Newman, N.; Fu, T.; Ross, J.; Chan, J.

    1997-08-12T23:59:59.000Z

    Several methods have been found to make p-type gallium nitride. P-type gallium nitride has long been sought for electronic devices. N-type gallium nitride is readily available. Discovery of p-type gallium nitride and the methods for making it will enable its use in ultraviolet and blue light-emitting diodes and lasers. pGaN will further enable blue photocathode elements to be made. Molecular beam epitaxy on substrates held at the proper temperatures, assisted by a nitrogen beam of the proper energy produced several types of p-type GaN with hole concentrations of about 5{times}10{sup 11} /cm{sup 3} and hole mobilities of about 500 cm{sup 2} /V-sec, measured at 250 K. P-type GaN can be formed of unintentionally-doped material or can be doped with magnesium by diffusion, ion implantation, or co-evaporation. When applicable, the nitrogen can be substituted with other group III elements such as Al. 9 figs.

  2. Local environment and composition of magnesium gallium layered...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    environment and composition of magnesium gallium layered double hydroxides determined from solid-state 1H and 71Ga NMR Local environment and composition of magnesium gallium...

  3. Self- and zinc diffusion in gallium antimonide

    SciTech Connect (OSTI)

    Nicols, Samuel Piers

    2002-03-26T23:59:59.000Z

    The technological age has in large part been driven by the applications of semiconductors, and most notably by silicon. Our lives have been thoroughly changed by devices using the broad range of semiconductor technology developed over the past forty years. Much of the technological development has its foundation in research carried out on the different semiconductors whose properties can be exploited to make transistors, lasers, and many other devices. While the technological focus has largely been on silicon, many other semiconductor systems have applications in industry and offer formidable academic challenges. Diffusion studies belong to the most basic studies in semiconductors, important from both an application as well as research standpoint. Diffusion processes govern the junctions formed for device applications. As the device dimensions are decreased and the dopant concentrations increased, keeping pace with Moore's Law, a deeper understanding of diffusion is necessary to establish and maintain the sharp dopant profiles engineered for optimal device performance. From an academic viewpoint, diffusion in semiconductors allows for the study of point defects. Very few techniques exist which allow for the extraction of as much information of their properties. This study focuses on diffusion in the semiconductor gallium antimonide (GaSb). As will become clear, this compound semiconductor proves to be a powerful one for investigating both self- and foreign atom diffusion. While the results have direct applications for work on GaSb devices, the results should also be taken in the broader context of III-V semiconductors. Results here can be compared and contrasted to results in systems such as GaAs and even GaN, indicating trends within this common group of semiconductors. The results also have direct importance for ternary and quaternary semiconductor systems used in devices such as high speed InP/GaAsSb/InP double heterojunction bipolar transistors (DHBT) [Dvorak, (2001)]. Many of the findings which will be reported here were previously published in three journal articles. Hartmut Bracht was the lead author on two articles on self-diffusion studies in GaSb [Bracht, (2001), (2000)], while this report's author was the lead author on Zn diffusion results [Nicols, (2001)]. Much of the information contained herein can be found in those articles, but a more detailed treatment is presented here.

  4. IEEE Spectrum: Thin-Film Trick Makes Gallium Arsenide Devices Cheap http://spectrum.ieee.org/semiconductors/materials/thinfilm-trick-makes-gallium-arsenide-devices-cheap[5/22/2010 1:39:13 PM

    E-Print Network [OSTI]

    Rogers, John A.

    to build devices--including solar cells and infrared cameras--using highly efficient but notoriously pricey's energy into electricity, while silicon cells max out at about 20 percent efficiency. The problem Electronics for Smart Grid Technologies &... Available... Reducing Physical Verification Cycle Times Available

  5. IEEE ELECTRON DEVICE LETTERS, VOL. 24, NO. 4, APRIL 2003 227 RF MEMS Switches Fabricated on

    E-Print Network [OSTI]

    Cetiner, Bedri A.

    with superior performance over con- ventional semiconductor devices [4]­[7]. Typically, RF MEMS switches-resistivity silicon wafers, gallium arsenide (GaAs) wafers, and quartz substrates using semiconductor Manuscript and surface planarization of wide metal lines prior to deposition of a metal membrane bridge, which poses

  6. EE Times: Semi News Groups claim breakthroughs in solar cells

    E-Print Network [OSTI]

    Rogers, John A.

    -based, multi-junction solar cells. Module cost is minimized by using high concentration ratio. XEE Times: Semi News Groups claim breakthroughs in solar cells Mark LaPedus Page 1 of 2 EE Times (05 separately claimed breakthroughs in solar cell production. Gallium arsenide (GaAs) and related compounds

  7. GLAS-PPE/2002-16 Department of Physics & Astronomy

    E-Print Network [OSTI]

    Glasgow, University of

    ratio) in semiconductor material here was laser drilling. The main advantages of using a laser is that it is independent of the material drilled (e.g. silicon, gallium arsenide, silicon carbide and CdZnTe) and it is the best technique available currently for GaAs. The drilling operation was carried out at Strathclyde

  8. LED Light Sources for Projection Display Applications

    E-Print Network [OSTI]

    Palffy-Muhoray, Peter

    LED Light Sources for Projection Display Applications By Chenhui Peng 04-13-2012 #12;Outline · 1. · The first practical LED is in red color and it is made with gallium arsenide (GaAs). 4http://en.wikipedia.org/wiki/Light with holes and release energy in the form of photons. 5http://en.wikipedia.org/wiki/Light-emitting_diode #12

  9. IBM Systems and Technology IBM SiGe 5PAe and

    E-Print Network [OSTI]

    IBM Systems and Technology IBM SiGe 5PAe and 1KW5PAe technologies Keep pace with mobile advances SiGe offerings featuring copper pillar and through-silicon-via options Take advantage of ongoing to solutions based on gallium arsenide (GaAs) technology, for example, the IBM SiGe 5PAe family offers several

  10. Thermoelectric Properties of Some Cobalt Phosphide-Arsenide Compounds Anucha Watcharapasorn*

    E-Print Network [OSTI]

    Thermoelectric Properties of Some Cobalt Phosphide-Arsenide Compounds Anucha Watcharapasorn been synthesized and their thermoelectric properties measured. All three samples show semiconductingAsx system have also been synthesized and their thermoelectric properties are currently being investigated

  11. Reflectance-difference spectroscopy of mixed arsenic-rich phases of gallium arsenide ,,001... M. J. Begarney,1

    E-Print Network [OSTI]

    Li, Lian

    rough quali- tative agreement with the experimental data. Based on more recent, first, University of California, Los Angeles, California 90095 2 Department of Physics and Laboratory for Surface closely match the RDS data, discrepancies in the energies and mag- nitudes of spectral features remain

  12. Recovery of gallium from aluminum industry residues

    SciTech Connect (OSTI)

    Carvalho, M.S.; Neto, K.C.M.; Nobrega, A.W.; Medeiros, J.A.

    2000-01-01T23:59:59.000Z

    A procedure is proposed to recover gallium from flue dust aluminum residues produced in plants by using solid-phase extraction with a commercial polyether-type polyurethane foam (PUF). Gallium can be separated from high concentrations of aluminum, iron, nickel, titanium, vanadium, copper, zinc, sulfate, fluoride, and chloride by extraction with PUF from 3 M sulfuric acid and 3 M sodium chloride concentration medium with at least a 92% efficiency. Gallium backextraction was fast and quantitative with ethanol solution. In all recovery steps commercial-grade reagents could be used, including tap water. The recovered gallium was precipitated with sodium hydroxide solution, purified by dissolution and precipitation, calcinated, and the final oxide was 98.6% pure.

  13. Defect studies in low-temperature-grown GaAs

    SciTech Connect (OSTI)

    Bliss, D.E.

    1992-11-01T23:59:59.000Z

    High content of excess As is incorporated in GaAs grown by low-temperature molecular-beam-epitaxy (LTMBE). The excess As exists primarily as As antisite defects AsGa and a lesser extent of gallium vacancies V[sub Ga]. The neutral AsGa-related defects were measured by infrared absorption at 1[mu]m. Gallium vacancies, V[sub Ga], was investigated by slow positron annihilation. Dependence of defect contents on doping was studied by Si and Be dopants. No free carriers are generated by n-type or p-type doping up to 10[sup 19] cm[sup [minus]3] Si or Be. Raman data indicate Be occupies Ga substitutional sites but Si atom is not substitutional. Si induces more As[sub Ga] in the layer. As As[sub Ga] increases, photoquenchable As[sub Ga] decreases. Fraction of photoquenchable defects correlates to defects within 3 nearest neighbor separations disrupting the metastability. Annealing reduces neutral As[sub Ga] content around 500C, similar to irradiation damaged and plastically deformed Ga[sub As], as opposed to bulk grown GaAs in which As[sub Ga]-related defects are stable up to 1100C. The lower temperature defect removal is due to V[sub Ga] enhanced diffusion of As[sub Ga] to As precipitates. The supersaturated V[sub GA] and also decreases during annealing. Annealing kinetics for As[sub Ga]-related defects gives 2.0 [plus minus] 0.3 eV and 1.5 [plus minus] 0.3 eV migration enthalpies for the As[sub Ga] and V[sub Ga]. This represents the difference between Ga and As atoms hopping into the vacancy. The non-photoquenchable As[sub Ga]-related defects anneal with an activation energy of 1.1 [plus minus] 0.3eV. Be acceptors can be activated by 800C annealing. Temperature difference between defect annealing and Be activation formation of As[sub Ga]-Be[sub Ga] pairs. Si donors can only be partially activated.

  14. (Data in kilograms of gallium content unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2009. One company in Utah

    E-Print Network [OSTI]

    58 GALLIUM (Data in kilograms of gallium content unless otherwise noted) Domestic Production 98% of domestic gallium consumption. About 67% of the gallium consumed was used in integrated and Use: No domestic primary gallium recovery was reported in 2009. One company in Utah recovered

  15. Au-free Ohmic Contacts to Gallium Nitride and Graphene 

    E-Print Network [OSTI]

    Ravikirthi, Pradhyumna

    2014-08-10T23:59:59.000Z

    This work deals with Au-free contact metallization schemes for gallium nitride (GaN) and graphene semiconductors. Graphene and gallium nitride are promising materials that can potentially be integrated together in the near future for high frequency...

  16. Au-free Ohmic Contacts to Gallium Nitride and Graphene

    E-Print Network [OSTI]

    Ravikirthi, Pradhyumna

    2014-08-10T23:59:59.000Z

    This work deals with Au-free contact metallization schemes for gallium nitride (GaN) and graphene semiconductors. Graphene and gallium nitride are promising materials that can potentially be integrated together in the near future for high frequency...

  17. Effect of Gallium Nitride Template Layer Strain on the Growth...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Gallium Nitride Template Layer Strain on the Growth of InxGa1-xNGaN Multiple Quantum Well Light Emitting Diodes. Effect of Gallium Nitride Template Layer Strain on the Growth of...

  18. Aluminum arsenide cleaved-edge overgrown quantum wires T. Zibold, D. Schuh, M. Bichler, F. Ertl, G. Abstreiter, and M. Grayson

    E-Print Network [OSTI]

    Grayson, Matthew

    Aluminum arsenide cleaved-edge overgrown quantum wires J. Moser,a T. Zibold, D. Schuh, M. Bichler measurements in quantum wires made of aluminum arsenide, a heavy-mass, multivalley one-dimensional 1D system, and G0=2e2 /h was observed in the presence of disorder.3 Aluminum arsenide AlAs is an alternate heavy

  19. Synthesis and characterization of visible emission from rare-earth doped aluminum nitride, gallium nitride and gallium aluminum nitride powders and thin films

    E-Print Network [OSTI]

    Tao, Jonathan Huai-Tse

    2010-01-01T23:59:59.000Z

    Gallium Nitride Doped With Europium," J. Appl. Phys. , 95Electroluminescence of Europium-doped Gallium Oxide ThinLuminescence Properties of Europium– terbium Double

  20. Gallium nitride junction field-effect transistor

    DOE Patents [OSTI]

    Zolper, John C. (Albuquerque, NM); Shul, Randy J. (Albuquerque, NM)

    1999-01-01T23:59:59.000Z

    An all-ion implanted gallium-nitride (GaN) junction field-effect transistor (JFET) and method of making the same. Also disclosed are various ion implants, both n- and p-type, together with or without phosphorous co-implantation, in selected III-V semiconductor materials.

  1. Pulmonary gallium-67 uptake in amiodarone pneumonitis

    SciTech Connect (OSTI)

    van Rooij, W.J.; van der Meer, S.C.; van Royen, E.A.; van Zandwijk, N.; Darmanata, J.I.

    1984-02-01T23:59:59.000Z

    Three patients are presented suffering from interstitial pneumonitis caused by amiodarone. Pulmonary Ga-67 uptake occurred in all three. There appeared to be a discrepancy between the scintigraphic and radiographic findings in two patients. Gallium-67 lung scintigraphy may offer an early, sensitive indicator for amiodarone pneumonitis.

  2. Gallium nitride junction field-effect transistor

    DOE Patents [OSTI]

    Zolper, J.C.; Shul, R.J.

    1999-02-02T23:59:59.000Z

    An ion implanted gallium-nitride (GaN) junction field-effect transistor (JFET) and method of making the same are disclosed. Also disclosed are various ion implants, both n- and p-type, together with or without phosphorus co-implantation, in selected III-V semiconductor materials. 19 figs.

  3. (Data in kilograms of gallium content unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2005. One company in Utah

    E-Print Network [OSTI]

    66 GALLIUM (Data in kilograms of gallium content unless otherwise noted) Domestic Production, [(703) 648-7719, dkramer@usgs.gov, fax: (703) 648-7975] #12;67 GALLIUM Consolidation of companies and Use: No domestic primary gallium recovery was reported in 2005. One company in Utah recovered

  4. (Data in kilograms of gallium content, unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 1998. Two companies in

    E-Print Network [OSTI]

    66 GALLIUM (Data in kilograms of gallium content, unless otherwise noted) Domestic Production A. Kramer [(703) 648-7719, dkramer@usgs.gov, fax: (703) 648-7722] #12;67 GALLIUM Events, Trends and Use: No domestic primary gallium recovery was reported in 1998. Two companies in Oklahoma and Utah

  5. Iron Arsenides--The New Family of High TC Magnetic Superconductors

    E-Print Network [OSTI]

    Weston, Ken

    Iron Arsenides--The New Family of High TC Magnetic Superconductors Jeff Lynn NIST Center Superconductors · (Brief) History of Magnetic Superconductors ­ Magnetic Impurities ­ Long Range Magnetic Order: Coexistence and Competition · Cuprate Superconductors--Highly Correlated Electron Systems ­ Undoped systems

  6. Interactions of zircaloy cladding with gallium -- 1997 status

    SciTech Connect (OSTI)

    Wilson, D.F.; DiStefano, J.R.; King, J.F.; Manneschmidt, E.T.; Strizak, J.P.

    1997-11-01T23:59:59.000Z

    A four phase program has been implemented to evaluate the effect of gallium in mixed oxide (MOX) fuel derived from weapons grade (WG) plutonium on Zircaloy cladding performance. The objective is to demonstrate that low levels of gallium will not compromise the performance of the MOX fuel system in LWR. This graded, four phase experimental program will evaluate the performance of prototypic Zircaloy cladding materials against: (1) liquid gallium (Phase 1), (2) various concentrations of Ga{sub 2}O{sub 3} (Phase 2), (3) centrally heated surrogate fuel pellets with expected levels of gallium (Phase 3), and (4) centrally heated prototypic MOX fuel pellets (Phase 4). This status report describes the results of an initial series of tests for phases 1 and 2. Three types of tests are being performed: (1) corrosion, (2) liquid metal embrittlement (LME), and (3) corrosion mechanical. These tests are designed to determine the corrosion mechanisms, thresholds for temperature and concentration of gallium that may delineate behavioral regimes, and changes in mechanical properties of Zircaloy. Initial results have generally been favorable for the use of WG-MOX fuel. The MOX fuel cladding, Zircaloy, does react with gallium to form intermetallic compounds at {ge} 300 C; however, this reaction is limited by the mass of gallium and is therefore not expected to be significant with a low level (in parts per million) of gallium in the MOX fuel. While continued migration of gallium into the initially formed intermetallic compound results in large stresses that can lead to distortion, this is also highly unlikely because of the low mass of gallium or gallium oxide present and expected clad temperatures below 400 C. Furthermore, no evidence for grain boundary penetration by gallium has been observed.

  7. Light-Emitting Diodes on Semipolar Bulk Gallium Nitride Substrate...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    semipolar light-emitting diodes (LEDs) on low-defect bulk gallium nitride (GaN) substrates. Peak internal quantum efficiency (IQE) values of greater than 80% are...

  8. Photonuclear Reaction Cross Sections for Gallium Isotopes

    E-Print Network [OSTI]

    Serkan Akkoyun; Tuncay Bayram

    2014-09-08T23:59:59.000Z

    The photon induced reactions which are named as photonuclear reactions have a great importance in many field of nuclear, radiation physics and related fields. Since we have planned to perform photonuclear reaction on gallium target with bremmstrahlung photons from clinical linear accelerator in the future, the cross-sections of neutron (photo-neutron ({\\gamma},xn)) and proton (photo-proton ({\\gamma},xn)) productions after photon activation have been calculated by using TALYS 1.2 computer code in this study. The target nucleus has been considered gallium which has two stable isotopes, 69Ga and 71Ga. According to the results, we have seen that the calculations are in harmony in the limited literature values. Furthermore, the pre-equilibrium and compound process contributions to the total cross-section have been investigated.

  9. Gallium nanoparticles grow where light is

    E-Print Network [OSTI]

    K. F. MacDonald; W. S. Brocklesby; V. I. Emelyanov; V. A. Fedotov; S. Pochon; K. J. Ross; G. Stevens; N. I. Zheludev

    2001-05-15T23:59:59.000Z

    The study of metallic nanoparticles has a long tradition in linear and nonlinear optics [1], with current emphasis on the ultrafast dynamics, size, shape and collective effects in their optical response [2-6]. Nanoparticles also represent the ultimate confined geometry:high surface-to-volume ratios lead to local field enhancements and a range of dramatic modifications of the material's properties and phase diagram [7-9]. Confined gallium has become a subject of special interest as the light-induced structural phase transition recently observed in gallium films [10, 11] has allowed for the demonstration of all-optical switching devices that operate at low laser power [12]. Spontaneous self-assembly has been the main approach to the preparation of nanoparticles (for a review see 13). Here we report that light can dramatically influence the nanoparticle self-assembly process: illumination of a substrate exposed to a beam of gallium atoms results in the formation of nanoparticles with a relatively narrow size distribution. Very low light intensities, below the threshold for thermally-induced evaporation, exert considerable control over nanoparticle formation through non-thermal atomic desorption induced by electronic excitation.

  10. GALLIUM--2001 29.1 By Deborah A. Kramer

    E-Print Network [OSTI]

    the largest application for gallium, with optoelectronic devices [mostly laser diodes and light near the town of McDermitt in Humboldt County, NV. The company began initial drilling in October and announced preliminary results in November. According to the drilling results, gallium concentrations over

  11. Delta-phase manganese gallium on gallium nitride: a magnetically tunable spintronic system

    E-Print Network [OSTI]

    with Mn:Ga ratio between 1:1 to 1.5:1 is grown on wurtzite gallium nitride and scandium nitride substrates. Results suggest that for growth on wurtzite GaN, Ga-polar surface promotes quicker interface formation epitaxially on top of wide band-gap Ga-polar wurtzite GaN(0001), with controllable magnetism by adjusting

  12. GaAs photoconductive semiconductor switch

    DOE Patents [OSTI]

    Loubriel, G.M.; Baca, A.G.; Zutavern, F.J.

    1998-09-08T23:59:59.000Z

    A high gain, optically triggered, photoconductive semiconductor switch (PCSS) implemented in GaAs as a reverse-biased pin structure with a passivation layer above the intrinsic GaAs substrate in the gap between the two electrodes of the device is disclosed. The reverse-biased configuration in combination with the addition of the passivation layer greatly reduces surface current leakage that has been a problem for prior PCSS devices and enables employment of the much less expensive and more reliable DC charging systems instead of the pulsed charging systems that needed to be used with prior PCSS devices. 5 figs.

  13. GaAs photoconductive semiconductor switch

    DOE Patents [OSTI]

    Loubriel, Guillermo M. (Sandia Park, NM); Baca, Albert G. (Albuquerque, NM); Zutavern, Fred J. (Albuquerque, NM)

    1998-01-01T23:59:59.000Z

    A high gain, optically triggered, photoconductive semiconductor switch (PCSS) implemented in GaAs as a reverse-biased pin structure with a passivation layer above the intrinsic GaAs substrate in the gap between the two electrodes of the device. The reverse-biased configuration in combination with the addition of the passivation layer greatly reduces surface current leakage that has been a problem for prior PCSS devices and enables employment of the much less expensive and more reliable DC charging systems instead of the pulsed charging systems that needed to be used with prior PCSS devices.

  14. Compatibility of ITER candidate structural materials with static gallium

    SciTech Connect (OSTI)

    Luebbers, P.R.; Michaud, W.F.; Chopra, O.K.

    1993-12-01T23:59:59.000Z

    Tests were conducted on the compatibility of gallium with candidate structural materials for the International Thermonuclear Experimental Reactor, e.g., Type 316 SS, Inconel 625, and Nb-5 Mo-1 Zr alloy, as well as Armco iron, Nickel 270, and pure chromium. Type 316 stainless steel is least resistant to corrosion in static gallium and Nb-5 Mo-1 Zr alloy is most resistant. At 400{degrees}C, corrosion rates are {approx}4.0, 0.5, and 0.03 mm/yr for type 316 SS, Inconel 625, and Nb-5 Mo- 1 Zr alloy, respectively. The pure metals react rapidly with gallium. In contrast to findings in earlier studies, pure iron shows greater corrosion than nickel. The corrosion rates at 400{degrees}C are {ge}88 and 18 mm/yr, respectively, for Armco iron and Nickel 270. The results indicate that at temperatures up to 400{degrees}C, corrosion occurs primarily by dissolution and is accompanied by formation of metal/gallium intermetallic compounds. The solubility data for pure metals and oxygen in gallium are reviewed. The physical, chemical, and radioactive properties of gallium are also presented. The supply and availability of gallium, as well as price predictions through the year 2020, are summarized.

  15. (Data in kilograms of gallium content, unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 1996. Two companies in

    E-Print Network [OSTI]

    on world production of primary gallium were unavailable because data on the output of the few producers62 GALLIUM (Data in kilograms of gallium content, unless otherwise noted) Domestic Production in optoelectronic devices, which include light-emitting diodes (LED's), laser diodes, photodetectors, and solar

  16. Reversible expansion of gallium-stabilized (delta)-plutonium

    SciTech Connect (OSTI)

    Wolfer, W G; Oudot, B; Baclet, N

    2006-02-27T23:59:59.000Z

    It is shown that the transient expansion of plutonium-gallium alloys observed both in the lattice parameter as well as in the dimension of a sample held at ambient temperature can be explained by assuming incipient precipitation of Pu{sub 3}Ga. However, this ordered {zeta}-phase is also subject to radiation-induced disordering. As a result, the gallium-stabilized {delta}-phase, being metastable at ambient temperature, is driven towards thermodynamic equilibrium by radiation-enhanced diffusion of gallium and at the same time reverted back to its metastable state by radiation-induced disordering. A steady state is reached in which only a modest fraction of the gallium present is arranged in ordered {zeta}-phase regions.

  17. High Pressure X-ray Diffraction Study on Icosahedral Boron Arsenide (B12As2)

    SciTech Connect (OSTI)

    J Wu; H Zhu; D Hou; C Ji; C Whiteley; J Edgar; Y Ma

    2011-12-31T23:59:59.000Z

    The high pressure properties of icosahedral boron arsenide (B12As2) were studied by in situ X-ray diffraction measurements at pressures up to 25.5 GPa at room temperature. B12As2 retains its rhombohedral structure; no phase transition was observed in the pressure range. The bulk modulus was determined to be 216 GPa with the pressure derivative 2.2. Anisotropy was observed in the compressibility of B12As2-c-axis was 16.2% more compressible than a-axis. The boron icosahedron plays a dominant role in the compressibility of boron-rich compounds.

  18. Formation of Porous Layers by Electrochemical Etching of Germanium and Gallium Arsenide for Cleave Engineered Layer Transfer (CELT) Application in High Efficiency Multi-Junction Solar Cells

    E-Print Network [OSTI]

    Fong, David Michael

    2012-01-01T23:59:59.000Z

    photovoltaic devices with a world record efficiency ofhigh efficiencies as compared to traditional photovoltaic

  19. Formation of Porous Layers by Electrochemical Etching of Germanium and Gallium Arsenide for Cleave Engineered Layer Transfer (CELT) Application in High Efficiency Multi-Junction Solar Cells

    E-Print Network [OSTI]

    Fong, David Michael

    2012-01-01T23:59:59.000Z

    film photovoltaics [1]. This roughly doubling of efficiencyMJ photovoltaics. MJ solar cells achieve higher efficiencies

  20. Formation of Porous Layers by Electrochemical Etching of Germanium and Gallium Arsenide for Cleave Engineered Layer Transfer (CELT) Application in High Efficiency Multi-Junction Solar Cells

    E-Print Network [OSTI]

    Fong, David Michael

    2012-01-01T23:59:59.000Z

    III! V Multijunction Solar Cells,” (2003). J. F. Geisz, etEfficiency Multi-Junction Solar Cells A thesis submitted inEfficiency Multi-Junction Solar Cells By David Michael Fong

  1. Formation of Porous Layers by Electrochemical Etching of Germanium and Gallium Arsenide for Cleave Engineered Layer Transfer (CELT) Application in High Efficiency Multi-Junction Solar Cells

    E-Print Network [OSTI]

    Fong, David Michael

    2012-01-01T23:59:59.000Z

    matched materials of Ge/GaInAs/InGaP commonly used in triplesee that Ge, GaInAs, and InGaP all have a similar latticeinitial substrate to grow an InGaP top layer followed by a

  2. Surface Science Analysis of GaAs Photocathodes Following Sustained...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Analysis of GaAs Photocathodes Following Sustained Electron Beam Delivery. Abstract: Degradation of the photocathode materials employed in photoinjectors represents a challenge for...

  3. Application of ultrasound in solvent extraction of nickel and gallium

    SciTech Connect (OSTI)

    Pesic, B.

    1996-07-01T23:59:59.000Z

    The effects of ultrasound on the rate of solvent extraction of nickel with Lix 65N and Lix 70, and gallium with Kelex 100 were investigated. These solvent extraction systems are noted by their sluggish nature. Low frequency (20 kHz) ultrasound increased the rates of extraction of nickel by factors of four to seven. The ultrasound had no effect on the final chemical equilibrium. Gallium extraction rates were enhanced with the use of ultrasound by as much as a factor of 15. Again, the ultrasound had no effect on extraction equilibrium. For both nickel and gallium, the enhanced rates were attributed to increased interfacial surface area associated with ultrasonically induced cavitation and microdroplet formation. The stability of the microdroplets permitted intermittent application of ultrasound with corresponding decreases in ultrasonic energy requirements. The lowest energy consumption was observed with short (0.25 to 5 s) bursts of high power (41 to 61 W) ultrasonic inputs. The study also provided insight into the factors that affect the complex extraction of gallium from sodium aluminate solutions. The rate controlling step was found to be the dehydration of the gallate ion, Ga(OH)4, and the first complex formation between gallium and Kelex 100. Sodium was found to enhance the extraction rate up to a point, beyond which increased concentration was detrimental. Increasing aluminum concentration was found to slow extraction rates. Modifiers and diluents were shown to markedly affect extraction rates even without ultrasound. Ketone modifiers, particularly 2-undecanone, when used with Kermac 470B or Escaid 200 diluents enhanced extraction rates of gallium to the point that the use of ultrasound provided no additional benefits. The positive effects of ketone modifiers for the solvent extraction of gallium had not been previously reported.

  4. Interaction of a Liquid Gallium Jet with ISTTOK Edge Plasmas

    SciTech Connect (OSTI)

    Gomes, R. B.; Fernandes, H.; Silva, C.; Pereira, T.; Figueiredo, J.; Carvalho, B.; Soares, A.; Duarte, P.; Varandas, C. [Associacao EURATOM/IST, Centro de Fusao Nuclear, Av. Rovisco Pais, 1049-001 Lisboa, Porugal (Portugal); Sarakovskis, A.; Lielausis, O.; Klyukin, A.; Platacis, E.; Tale, I. [Association EURATOM/University of Latvia, Institute of Solid State Physics, 8 Kengaraga Str., LV-1063 Riga (Latvia)

    2008-04-07T23:59:59.000Z

    The use of liquid metals as plasma facing components in tokamaks has recently experienced a renewed interest stimulated by their advantages in the development of a fusion reactor. Liquid metals have been proposed to solve problems related to the erosion and neutronic activation of solid walls submitted to high power loads allowing an efficient heat exhaust from fusion devices. Presently the most promising candidate materials are lithium and gallium. However, lithium has a short liquid state range when compared, for example, with gallium that has essentially better thermal properties and lower vapor pressure. To explore further these properties, ISTTOK tokamak is being used to test the interaction of a free flying, fully formed liquid gallium jet with the plasma. The interacting, 2.3 mm diameter, jet is generated by hydrostatic pressure and has a 2.5 m/s flow velocity. The liquid metal injector has been build to allow the positioning of the jet inside the tokamak chamber, within a 13 mm range. This paper presents the first obtained experimental results concerning the liquid gallium jet-plasma interaction. A stable jet has been obtained, which was not noticeably affected by the magnetic field transients. ISTTOK has been successfully operated with the gallium jet without degradation of the discharge or a significant plasma contamination by liquid metal. This observation is supported by spectroscopic measurements showing that gallium radiation is limited to the region around the jet. Furthermore, the power deposited on the jet has been evaluated at different radial locations and the surface temperature increase estimated.

  5. Thermal Conductivity and Seebeck Coefficients of Icosahedral Boron Arsenide Films on Silicon Carbide

    SciTech Connect (OSTI)

    Y Gong; Y Zhang; M Dudley; Y Zhang; J Edgar; P Heard; M Kuball

    2011-12-31T23:59:59.000Z

    The thermal conductivity of icosahedral boron arsenide (B{sub 12}As{sub 2}) films grown on (0001) 6H-SiC substrates by chemical vapor deposition was studied by the 3{omega} technique. The room temperature thermal conductivity decreased from 27.0 to 15.3 W/m K as the growth temperature was decreased from 1450 to 1275 C. This is mainly attributed to the differences in the impurity concentration and microstructure, determined from secondary ion mass spectrometry and high resolution transmission electron microscopy, respectively. Callaway's theory was applied to calculate the temperature-dependent thermal conductivity, and the results are in good agreement with the experimental data. Seebeck coefficients were determined as 107 {micro}V/K and 136 {micro}V/K for samples grown at 1350 C with AsH{sub 3}/B{sub 2}H{sub 6} flow ratio equals to 1:1 and 3:5, respectively.

  6. D10.7.2: Results for GaAs photocathodes

    E-Print Network [OSTI]

    Xiang, R

    2013-01-01T23:59:59.000Z

    HZDR plans to apply bulk GaAs photocathode in SRF gun for high current electron source. Supported by this project, a preparation system for GaAs photocathode has been developed. The cathode plugs special for GaAs wafer have been modified and proofed in SRF gun real running conditions. Virgin GaAs wafer was tested in the SRF gun cavity, and the first GaAs activation was performed.

  7. The Coefficients of Thermal Expansion of Boron Arsenide (B12As2) Between 25 C and 850 C

    SciTech Connect (OSTI)

    Whiteley, Clinton E. [Kansas State University; Kirkham, Melanie J [ORNL; Edgar, J H [Kansas State University

    2013-01-01T23:59:59.000Z

    The semiconductor boron arsenide has a high 10B density, a wide bandgap, and a high melting temperature, all of which make it an interesting candidate for high-temperature electronic devices and radiation detectors. The present investigation was undertaken to determine the coefficients of thermal expansion for boron arsenide. B12As2 powder was synthesized from boron and arsenic heated in a sealed quartz ampoule at 1100 C for 72 hrs with excess boron. Using high temperature X-ray diffraction (HTXRD) between 25 C and 850 C, the average lattice coefficients of thermal expansion were measured perpendicular and parallel to the <111> axis in the rhombohedral setting (equivalent to the a and c axes in the hexagonal setting): 4.9x10-6 K-1 and 5.3x10-6 K-1, respectively. The average unit cell volumetric coefficient of thermal expansion was determined to be 1.5x10-5 K-1.

  8. In-Plane Electronic Anisotropy of Underdoped ___122___ Fe-Arsenide Superconductors Revealed by Measurements of Detwinned Single Crystals

    SciTech Connect (OSTI)

    Fisher, Ian Randal

    2012-05-08T23:59:59.000Z

    The parent phases of the Fe-arsenide superconductors harbor an antiferromagnetic ground state. Significantly, the Neel transition is either preceded or accompanied by a structural transition that breaks the four fold symmetry of the high-temperature lattice. Borrowing language from the field of soft condensed matter physics, this broken discrete rotational symmetry is widely referred to as an Ising nematic phase transition. Understanding the origin of this effect is a key component of a complete theoretical description of the occurrence of superconductivity in this family of compounds, motivating both theoretical and experimental investigation of the nematic transition and the associated in-plane anisotropy. Here we review recent experimental progress in determining the intrinsic in-plane electronic anisotropy as revealed by resistivity, reflectivity and ARPES measurements of detwinned single crystals of underdoped Fe arsenide superconductors in the '122' family of compounds.

  9. Field dependent emission rates in radiation damaged GaAs

    SciTech Connect (OSTI)

    Fleming, R. M.; Myers, S. M.; Wampler, W. R.; Lang, D. V.; Seager, C. H.; Campbell, J. M. [Sandia National Laboratories, Albuquerque, New Mexico 87185-1415 (United States)

    2014-07-07T23:59:59.000Z

    We have measured the temperature and field dependence of emission rates from five traps in electron damaged GaAs. Four of the traps have previously been identified as radiation defects. One of the traps, seen in higher doped diodes, has not been previously identified. We have fit the data to a multiphonon emission theory that allows recombination in GaAs to be characterized over a broad range of temperature and electric field. These results demonstrate an efficient method to calculate field-dependent emission rates in GaAs.

  10. Pair distribution function study on compression of liquid gallium

    SciTech Connect (OSTI)

    Luo, Shengnian [Los Alamos National Laboratory; Yu, Tony [SUNY-SB; Chen, Jiuhua [SUNY-SB; Ehm, Lars [SUNY-SB; Guo, Quanzhong [SUNY-SB; Parise, John [SUNY-SB

    2008-01-01T23:59:59.000Z

    Integrating a hydrothermal diamond anvil cell (HDAC) and focused high energy x-ray beam from the superconductor wiggler X17 beamline at the National Synchrotron Light Source (NSLS) at the Brookhaven National Laboratory (BNL), we have successfully collected high quality total x-ray scattering data of liquid gallium. The experiments were conducted at a pressure range from 0.1GPa up to 2GPa at ambient temperature. For the first time, pair distribution functions (PDF) for liquid gallium at high pressure were derived up to 10 {angstrom}. Liquid gallium structure has been studied by x-ray absorption (Di Cicco & Filipponi, 1993; Wei et al., 2000; Comez et al., 2001), x-ray diffraction studies (Waseda & Suzuki, 1972), and molecular dynamics simulation (Tsay, 1993; Hui et al., 2002). These previous reports have focused on the 1st nearest neighbor structure, which tells us little about the atomic arrangement outside the first shell in non- crystalline materials. This study focuses on the structure of liquid gallium and the atomic structure change due to compression. The PDF results show that the observed atomic distance of the first nearest neighbor at 2.78 {angstrom} (first G(r) peak and its shoulder at the higher Q position) is consistent with previous studies by x-ray absorption (2.76 {angstrom}, Comez et al., 2001). We have also observed that the first nearest neighbor peak position did not change with pressure increasing, while the farther peaks positions in the intermediate distance range decreased with pressure increasing. This leads to a conclusion of the possible existence of 'locally rigid units' in the liquid. With the addition of reverse Monte Carlo modeling, we have observed that the coordination number in the local rigit unit increases with pressure. The bulk modulus of liquid gallium derived from the volume compression curve at ambient temperature (300K) is 12.1(6) GPa.

  11. (Data in kilograms of gallium content, unless noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 1995. Two companies in

    E-Print Network [OSTI]

    : No domestic primary gallium recovery was reported in 1995. Two companies in Oklahoma and Utah recovered devices, which include light-emitting diodes (LED's), laser diodes, photodetectors, and solar cells contract to a consortium of private companies to develop gallium nitride technology. Blue LED's are useful

  12. (Data in kilograms of gallium content, unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2002. Two companies in

    E-Print Network [OSTI]

    and Use: No domestic primary gallium recovery was reported in 2002. Two companies in Oklahoma and Utah diodes, photodetectors, and solar cells. Integrated circuits represented 65% of gallium demand forecasts of market growth, several companies were consolidating, reducing, or eliminating their Ga

  13. Electrical degradation mechanisms of RF power GaAs PHEMTs

    E-Print Network [OSTI]

    Villanueva, Anita A. (Anita Ariel), 1978-

    2007-01-01T23:59:59.000Z

    GaAs Pseudomorphic High-Electron Mobility Transistors (PHEMTs) are widely used in RF power applications. Since these devices typically operate at high power levels and under high voltage biasing, their electrical reliability ...

  14. Nanosecond dynamics of a gallium mirror's light-induced reflectivity change

    E-Print Network [OSTI]

    V. Albanis; S. Dhanjal; V. I. Emelyanov; V. A. Fedotov; K. F. MacDonald; P. Petropoulos; D. J. Richardson; N. I. Zheludev

    2000-10-05T23:59:59.000Z

    Transient pump-probe optical reflectivity measurements of the nano/microsecond dynamics of a fully reversible, light-induced, surface-assisted metallization of gallium interfaced with silica are reported. The metallization leads to a considerable increase in the interface's reflectivity when solid a-gallium is on the verge of melting. The reflectivity change was found to be a cumulative effect that grows with light intensity and pulse duration. The reflectivity relaxes back to that of alpha-gallium when the excitation is withdrawn in a time that increases critically at gallium's melting point. The effect is attributed to a non-thermal light-induced structural phase transition.

  15. Preparation Of Copper Indium Gallium Diselenide Films For Solar Cells

    DOE Patents [OSTI]

    Bhattacharya, Raghu N. (Littleton, CO); Contreras, Miguel A. (Golden, CO); Keane, James (Lakewood, CO); Tennant, Andrew L. (Denver, CO), Tuttle, John R. (Denver, CO); Ramanathan, Kannan (Lakewood, CO); Noufi, Rommel (Golden, CO)

    1998-08-08T23:59:59.000Z

    High quality thin films of copper-indium-gallium-diselenide useful in the production of solar cells are prepared by electrodepositing at least one of the constituent metals onto a glass/Mo substrate, followed by physical vapor deposition of copper and selenium or indium and selenium to adjust the final stoichiometry of the thin film to approximately Cu(In,Ga)Se.sub.2. Using an AC voltage of 1-100 KHz in combination with a DC voltage for electrodeposition improves the morphology and growth rate of the deposited thin film. An electrodeposition solution comprising at least in part an organic solvent may be used in conjunction with an increased cathodic potential to increase the gallium content of the electrodeposited thin film.

  16. Nonlinear Terahertz Metamaterials via Field-Enhanced Carrier Dynamics in GaAs

    E-Print Network [OSTI]

    Fan, Kebin

    We demonstrate nonlinear metamaterial split ring resonators (SRRs) on GaAs at terahertz frequencies. For SRRs on doped GaAs films, incident terahertz radiation with peak fields of ?20–160??kV/cm drives intervalley scattering. ...

  17. Synthesis and microstructure of gallium phosphide nanowires W. S. Shi, Y. F. Zheng, N. Wang,a)

    E-Print Network [OSTI]

    Zheng, Yufeng

    Synthesis and microstructure of gallium phosphide nanowires W. S. Shi, Y. F. Zheng, N. Wang,a) C. S May 2001 Gallium phosphide GaP nanowires of 22 nm in diameter and hundreds micrometers in length were synthesized by laser ablation of a powder mixture of GaP and gallium oxide (Ga2O3 . The morphology

  18. Synthesis and use of (polyfluoroaryl)fluoroanions of aluminum, gallium and indium

    DOE Patents [OSTI]

    Marks, Tobin J. (Evanston, IL); Chen, You-Xian (Midland, MI)

    2000-01-01T23:59:59.000Z

    Salts of (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium are described. The (polyfluoroaryl)fluoroanions have the formula [ER'R"R'"F].sup..crclbar. wherein E is aluminum, gallium, or indium, wherein F is fluorine, and wherein R', R", and R'" is each a fluorinated phenyl, fluorinated biphenyl, or fluorinated polycyclic group.

  19. Gallium/aluminum nanocomposite material for nonlinear optics and nonlinear plasmonics

    E-Print Network [OSTI]

    Zheludev, Nikolay

    Gallium/aluminum nanocomposite material for nonlinear optics and nonlinear plasmonics A. V penetration of gallium into an aluminum film. These composite films form mirrorlike interfaces with silica optics and active plasmonics. The material is a polycrystalline aluminum film on a silica sub- strate

  20. Formation mechanisms of spatially-directed zincblende gallium nitride nanocrystals

    SciTech Connect (OSTI)

    Wood, A. W. [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109 (United States); Collino, R. R. [Department of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan 48109 (United States); Cardozo, B. L. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 (United States); Naab, F. [Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109 (United States); Wang, Y. Q. [Materials Science and Technology Division, Los Alamos National Lab, Los Alamos, New Mexico 87545 (United States); Goldman, R. S. [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109 (United States); Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 (United States)

    2011-12-15T23:59:59.000Z

    We report on the spatially selective formation of GaN nanocrystals embedded in GaAs. Broad-area N{sup +} implantation followed by rapid thermal annealing leads to the formation of nanocrystals at the depth of maximum ion damage. With additional irradiation using a Ga{sup +} focused ion beam, selective lateral positioning of the nanocrystals within the GaAs matrix is observed in isolated regions of increased vacancy concentration. Following rapid thermal annealing, the formation of zincblende GaN is observed in the regions of highest vacancy concentration. The nucleation of zincblende nanocrystals over the wurtzite phase of bulk GaN is consistent with the predictions of a thermodynamic model for the nanoscale size-dependence of GaN nucleation.

  1. Ga nanoparticle-enhanced photoluminescence of GaAs

    SciTech Connect (OSTI)

    Kang, M.; Al-Heji, A. A.; Jeon, S.; Wu, J. H. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States)] [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Lee, J.-E.; Saucer, T. W.; Zhao, L.; Sih, V. [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-1040 (United States)] [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-1040 (United States); Katzenstein, A. L. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States) [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Department of Physics, Eckerd College, St. Petersburg, Florida 33711-4744 (United States); Sofferman, D. L. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States) [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Department of Physics, Adelphi University, Garden City, New York 11530-0701 (United States); Goldman, R. S. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States) [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-1040 (United States)

    2013-09-02T23:59:59.000Z

    We have examined the influence of surface Ga nanoparticles (NPs) on the enhancement of GaAs photoluminescence (PL) efficiency. We have utilized off-normal focused-ion-beam irradiation of GaAs surfaces to fabricate close-packed Ga NP arrays. The enhancement in PL efficiency is inversely proportional to the Ga NP diameter. The maximum PL enhancement occurs for the Ga NP diameter predicted to maximize the incident electromagnetic (EM) field enhancement. The PL enhancement is driven by the surface plasmon resonance (SPR)-induced enhancement of the incident EM field which overwhelms the SPR-induced suppression of the light emission.

  2. Spectroscopy of vanadium (III) doped gallium lanthanum sulphide chalcogenide glass

    E-Print Network [OSTI]

    Hughes, M; Rutt, H; Hewak, D

    2014-01-01T23:59:59.000Z

    Vanadium doped gallium lanthanum sulphide glass (V:GLS) displays three absorption bands at 580, 730 and 1155 nm identified by photoluminescence excitation measurements. Broad photoluminescence, with a full width half maximum (FWHM) of 500 nm, is observed peaking at 1500 nm when exciting at 514, 808 and 1064 nm. The fluorescence lifetime and quantum efficiency at 300 K were measured to be 33.4 us and 4 % respectively. From the available spectroscopic data we propose the vanadium ions valence to be 3+ and be in tetrahedral coordination The results indicate potential for development of a laser or optical amplifier based on V:GLS.

  3. Gallium phosphide high-temperature bipolar junction transistor

    SciTech Connect (OSTI)

    Zipperian, T.E.; Dawson, L.R.; Caffin, R.J.

    1981-03-01T23:59:59.000Z

    Preliminary results are reported on the development of a high-temperature (> 350/sup 0/C) gallium phosphide bipolar junction transistor (BJT) for goethermal and other energy applications. This four-layer p/sup +/n/sup -/pp/sup +/ structure was fromed by liquid phase epitaxy using a supercooling technique to insure uniform nucleation of the thin layers. Magnesium was used as the p-type dopant to avoid excessive out-diffusion into the lightly doped base. By appropriate choice of electrodes, the device may also be driven as an n-channel junction field-effect transistor. The gallium phosphide BJT is observed to have a common-emitter current gain peaking in the range of 6 to 10 (for temperatures from 20/sup 0/C to 400/sup 0/C) and a room-temperature, punchthrough-limited, collector-emitter breakdown voltage of approximately -6V. Other parameters of interest include an f/sub/ = 400 KHz (at 20/sup 0/C) and a collector base leakage current = 200 ..mu..A (at 350/sup 0/C).

  4. Gallium nitride microcavities formed by photoenhanced wet oxidation

    SciTech Connect (OSTI)

    Peng, L.-H.; Lu, C.-Y.; Wu, W.-H.; Wang, S.-L. [Department of Electrical Engineering and Institute of Electro-Optical Engineering, National Taiwan University, Taipei, Taiwan (China)

    2005-10-17T23:59:59.000Z

    We report the formation of gallium nitride (GaN) microcavities by manipulating a photoenhanced oxidation rate difference between the polar and nonpolar crystallographic planes of GaN. When immersed in a buffered acetic (CH{sub 3}COOH) electrolyte of pH{approx}6.2 at room temperature, it is shown that the photo-oxidation can proceed at a rate that is one order of magnitude slower on the nonpolar plane of {l_brace}1100{r_brace}{sub GaN} than on the polar plane of {l_brace}0001{r_brace}{sub GaN} due to the reduced surface field action. Gallium nitride microcavities bounded by optically smooth {l_brace}1100{r_brace} and {l_brace}1103{r_brace} facets can thus be preferentially formed on the c-plane sapphire substrate after dissolving the oxide layer. The optical properties of these GaN hexagonal cavities reveal characteristic peaks of whispering gallery modes in resonance with the GaN band edge emission spectrum. A typical cavity Q factor of 10{sup 3} is observed in these GaN microcavities due to a reduced optical scattering loss in the wet chemical reaction process.

  5. InGaAsN/GaAs heterojunction for multi-junction solar cells

    DOE Patents [OSTI]

    Kurtz, Steven R. (Albuquerque, NM); Allerman, Andrew A. (Albuquerque, NM); Klem, John F. (Albuquerque, NM); Jones, Eric D. (Edgewood, NM)

    2001-01-01T23:59:59.000Z

    An InGaAsN/GaAs semiconductor p-n heterojunction is disclosed for use in forming a 0.95-1.2 eV bandgap photodetector with application for use in high-efficiency multi-junction solar cells. The InGaAsN/GaAs p-n heterojunction is formed by epitaxially growing on a gallium arsenide (GaAs) or germanium (Ge) substrate an n-type indium gallium arsenide nitride (InGaAsN) layer having a semiconductor alloy composition In.sub.x Ga.sub.1-x As.sub.1-y N.sub.y with 0GaAs layer, with the InGaAsN and GaAs layers being lattice-matched to the substrate. The InGaAsN/GaAs p-n heterojunction can be epitaxially grown by either molecular beam epitaxy (MBE) or metalorganic chemical vapor deposition (MOCVD). The InGaAsN/GaAs p-n heterojunction provides a high open-circuit voltage of up to 0.62 volts and an internal quantum efficiency of >70%.

  6. Specific interaction of fluoride ions with aluminum and gallium solvates in an ethylene glycol solutions

    SciTech Connect (OSTI)

    Petrosyants, S.P.; Tsabel', E.R.; Buslaev, Yu.A.

    1986-01-01T23:59:59.000Z

    The interaction of aluminum chloride and gallium chloride with KF in ethylene glycol solutions with F:M/sup 3 +/ mole ratios approximately equal to 2 includes a step involving the formation of fluorine-containing species, in which the fluoride ions are held in the outer sphere of ethylene glycol solvates of aluminum and gallium. Complexes based on hexacoordinate solvates predominate in the solutions of aluminum, while in the case of gallium, in contrast to aluminum, the coexistence of tetra- and hexacoordinate complexes is characteristic. The configurational equilibrium in the solutions of gallium is one of the causes of the structurization of the solutions, i.e., polymerization due to the formation of H bonds between the fluoride ions and the coordinated ethylene glycol molecules.

  7. Luminescence dynamics and waveguide applications of europium doped gallium nitride powder

    E-Print Network [OSTI]

    Lipson, Michal

    Luminescence dynamics and waveguide applications of europium doped gallium nitride powder Carl B, bismuth shot, and europium ingot in an ammonia ambient to initially obtain chunks of the desired material

  8. First Results of the Testing of the Liquid Gallium Jet Limiter Concept for ISTTOK

    SciTech Connect (OSTI)

    Gomes, R. B.; Fernandes, H.; Silva, C.; Borba, D.; Carvalho, B.; Varandas, C. [Associacao EURATOM/IST, Centro de FuSao Nuclear, Av. Rovisco Pais, 1049-001 Lisbon (Portugal); Lielausis, O.; Klyukin, A.; Platacis, E.; Mikelsons, A.; Platnieks, I. [Association EURATOM/University of Latvia, Institute of Physics, 32 Miera Str., Salaspils, LV-2169 (Latvia)

    2006-12-04T23:59:59.000Z

    The use of liquid metals as plasma facing components in tokamaks has recently experienced a renewed interest stimulated by their advantages to the development of a fusion reactor. Liquid metals have been proposed to solve problems related to the erosion and neutronic activation of solid walls submitted to high power loads allowing an efficient heat exhaustion from fusion devices. Presently the most promising materials are Lithium and Gallium. ISTTOK, a small size tokamak, will be used to test the behavior of a liquid Gallium jet in the vacuum chamber and its influence on the plasma. This paper presents a description of the conceived setup as well as experimental results. The liquid Gallium jet is generated by hydrostatic pressure and injected in a radial position close to a moveable stainless steel limiter. Both the jet and the limiter positions are variable allowing for a controlled exposure of the liquid Gallium to the edge plasma. The main components of the Gallium loop are a MHD pump, the liquid metal injector and a filtering system. The MHD pump is of the induction type, based on rotating permanent magnets. The injector is build from a stainless steel pipe ended by a shaping nozzle. A setup has been developed to introduce oxide-free Gallium inside the loop's main supply tank. Raw liquid metal is placed inside a chamber heated and degassed under high vacuum while clean Gallium is extracted from the main body of the liquefied metal. Prior to installation on the tokamak, the experimental rig has been implemented using a Pyrex tube as test chamber to investigate the stability of the Gallium jet and its break-up length for several nozzle sizes. Results are presented in this paper. This rig was also useful to assess the behavior of the overall implemented apparatus.

  9. High-Temperature Decomposition of Brønsted Acid Sites in Gallium-Substituted Zeolites

    SciTech Connect (OSTI)

    K Al-majnouni; N Hould; W Lonergan; D Vlachos; R Lobo

    2011-12-31T23:59:59.000Z

    The dehydroxylation of Broensted acid sites (BAS) in Ga-substituted zeolites was investigated at temperatures up to 850 C using X-ray absorption spectroscopy (XAS), Fourier transform infrared spectroscopy (FTIR), and mass spectrometry-temperature programmed desorption (MS-TPD). X-ray absorption near-edge spectroscopy (XANES) revealed that the majority of gallium has tetrahedral coordination even after complete dehydroxylation. The interatomic gallium-oxygen distance and gallium coordination number determined by extended X-ray absorption fine structure (EXAFS) are consistent with gallium in tetrahedral coordination at low T (< 550 C). Upon heating Ga-Beta and Ga-ZSM5 to 850 C, analysis of the EXAFS showed that 70 and 80% of the gallium was still in tetrahedral coordination. The remainder of the gallium was found to be in octahedral coordination. No trigonal Ga atoms were observed. FTIR measurements carried out at similar temperatures show that the intensity of the OH vibration due to BAS has been eliminated. MS-TPD revealed that hydrogen in addition to water evolved from the samples during dehydroxylation. This shows that dehydrogenation in addition to dehydration is a mechanism that contributes to BAS decomposition. Dehydrogenation was further confirmed by exposing the sample to hydrogen to regenerate some of the BAS as monitored by FTIR and MS-TPD.

  10. Study of liquid gallium at high pressure using synchrotron x-ray

    SciTech Connect (OSTI)

    Yu, Tony; Guo Quanzhong; Parise, John [Department of Geosciences, Mineral Physics Institute, Stony Brook University, Stony Brook, New York 11794-2100 (United States); Chen Jiuhua [Department of Geosciences, Mineral Physics Institute, Stony Brook University, Stony Brook, New York 11794-2100 (United States); Department of Mechanical and Materials Engineering, Center for the Study of Matters at Extreme Conditions, Florida International University, Miami, Florida 33199 (United States); Ehm, Lars [Department of Geosciences, Mineral Physics Institute, Stony Brook University, Stony Brook, New York 11794-2100 (United States); National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973-5000 (United States); Huang Shu [Department of Mechanical and Materials Engineering, Center for the Study of Matters at Extreme Conditions, Florida International University, Miami, Florida 33199 (United States); Luo Shengnian [Physics Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

    2012-06-01T23:59:59.000Z

    Liquid gallium has been studied at high pressure up to 2 GPa and ambient temperature in a diamond anvil cell using high energy synchrotron x-ray beam. The total x-ray scattering data of liquid gallium were collected up to Q = 12 A{sup -1} and analyzed using pair distribution functions (PDF). The results indicate that the first nearest neighbor peak and second nearest neighbor (shoulder) peak of PDF in liquid gallium does not change with pressure, whereas the higher order (i.e., third and fourth) nearest neighbor peaks shift towards shorter distance with increasing pressure. Reverse Monte Carlo modeling based on the observed data shows that the coordination number in the liquid gallium increases with pressure from 10.5 at 0.3 GPa to 11.6 at 2 GPa. An atomic arrangement similar to the crystalline phase of Ga(II) with coordination number of 12 is proposed for the locally dense-packed rigid unit in liquid gallium. The volume compression data derived from the structure modeling yield a bulk modulus of 12.1(6) GPa for liquid gallium.

  11. Study of Magnetohydrodynamic Surface Waves on Liquid Gallium

    SciTech Connect (OSTI)

    Hantao Ji; William Fox; David Pace; H.L. Rappaport

    2004-05-13T23:59:59.000Z

    Magnetohydrodynamic (MHD) surface waves on liquid gallium are studied theoretically and experimentally in the small magnetic Reynolds number limit. A linear dispersion relation is derived when a horizontal magnetic field and a horizontal electric current is imposed. No wave damping is found in the shallow liquid limit while waves always damp in the deep liquid limit with a magnetic field parallel to the propagation direction. When the magnetic field is weak, waves are weakly damped and the real part of the dispersion is unaffected, while in the opposite limit waves are strongly damped with shortened wavelengths. In a table-top experiment, planar MHD surface waves on liquid gallium are studied in detail in the regime of weak magnetic field and deep liquid. A non-invasive diagnostic accurately measures surface waves at multiple locations by reflecting an array of lasers off the surface onto a screen, which is recorded by an Intensified-CCD camera. The measured dispersion relation is consistent with the linear theory with a reduced surface tension likely due to surface oxidation. In excellent agreement with linear theory, it is observed that surface waves are damped only when a horizontal magnetic field is imposed parallel to the propagation direction. No damping is observed under a perpendicular magnetic field. The existence of strong wave damping even without magnetic field suggests the importance of the surface oxide layer. Implications to the liquid metal wall concept in fusion reactors, especially on the wave damping and a Rayleigh-Taylor instability when the Lorentz force is used to support liquid metal layer against gravity, are discussed.

  12. Response of GaAs to fast intense laser pulses

    E-Print Network [OSTI]

    Graves, JS; Allen, Roland E.

    1998-01-01T23:59:59.000Z

    . The Hamiltonian is H ~ r !5 S ?1 V~r ! V ~ r ! ?2 D , ~1.1! so the bonding and antibonding states have energies ? 6 5 1 2 ~?11?2!6 1 2 @~?12?2! 2 14V ~ r !2#1/2. ~1.2! PRB 580163-1829/98/58~20!/13627~7!/$15.00 t intense laser pulses R. E... to TABLE II. Repulsive potential parameters for GaAs and Si. These values are appropriate when distances are measured in ? and energies in eV. a b g GaAs 263.7 -1227.5 3653.1 Si 263.2 -1027.0 2631.8 PRB 58D R. E. ALLEN an intense laser pulse...

  13. Accurate characterization and improvement of GaAs microstrip attenuation

    E-Print Network [OSTI]

    Carroll, James Mason

    1992-01-01T23:59:59.000Z

    Mason Carroll, B. S. , Rose-Hulman Institute of Technology Chair of Advisory Committee: Dr. Kai Chang Microstrip transmission lines are widely used in microv, ave circuits. The high frequencies cause the microstrip characteristics, especially... OF CONTENTS . . LIST OF FIGURES LIST OF TABLES. . CHAPTER I INTRODUCTION . . I. A Introduction. I. B Thesis Research Il GaAs MICROSTRlp ATTENUATION . II. A Characterization ol'Transmission Line Attenuation. . . . II. A. I Introduction. II. A. 2...

  14. By Deborah A. Kramer No primary gallium was produced in the United States in consumption were adjusted to reflect full industry coverage.

    E-Print Network [OSTI]

    that it would reopen its 50-ton-per-year gallium recovery facility in Pinjarra, Western Australia, in 1996

  15. Growth and structure of sputtered gallium nitride films

    SciTech Connect (OSTI)

    Yadav, Brajesh S.; Major, S. S.; Srinivasa, R. S. [Department of Physics, Indian Institute of Technology Bombay, Mumbai 400076 (India); Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai 400076 (India)

    2007-10-01T23:59:59.000Z

    GaN films have been deposited by radio frequency sputtering of a GaAs target with pure nitrogen. The growth, composition, and structure of the films deposited on quartz substrates have been studied by x-ray diffraction, transmission electron microscopy, and Raman spectroscopy. Films deposited below 300 deg. C are amorphous and As rich. Above 300 deg. C, polycrystalline, hexagonal GaN is formed, along with As rich amorphous phase, which reduces with increasing substrate temperature. At a substrate temperature of 700 deg. C, GaN films, practically free of amorphous phase, and As (<0.5 at. %) are formed. The preferred orientation depends strongly on the substrate temperature and is controlled by surface diffusion of adatoms during growth stage. Below 500 deg. C, the surface diffusion between planes dominates and results in the (1011) preferred orientation. Above 500 deg. C, the surface diffusion between grains takes over and results in (0002) preferred orientation.

  16. The role of screening of the electron-phonon interaction in relaxation of photoexcited electron-hole plasma in semiconductors

    SciTech Connect (OSTI)

    Kumekov, S. E. [Kazakh National Technical University (Kazakhstan)], E-mail: skumekov@mail.ru

    2008-08-15T23:59:59.000Z

    The role of screening of the interaction of the electron-hole plasma with optical phonons is analytically evaluated by the example of gallium arsenide.

  17. (Data in kilograms of gallium content, unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 1997. Two companies in

    E-Print Network [OSTI]

    and Use: No domestic primary gallium recovery was reported in 1997. Two companies in Oklahoma and Utah in optoelectronic devices, which include light-emitting diodes (LED's), laser diodes, photodetectors, and solar-than-expected increase in demand. The company planned to operate its refineries in France and Germany using stockpiled

  18. (Data in kilograms of gallium content, unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 1999. Two companies in

    E-Print Network [OSTI]

    and Use: No domestic primary gallium recovery was reported in 1999. Two companies in Oklahoma and Utah in optoelectronic devices, which include light-emitting diodes (LED's), laser diodes, photodetectors, and solar in July. The additional facility was expected to double the company's refinery capacity to 100

  19. Bandgap and band discontinuity in wurtzite/zincblende GaAs homomaterial heterostructure

    E-Print Network [OSTI]

    Shalish, Ilan

    Bandgap and band discontinuity in wurtzite/zincblende GaAs homomaterial heterostructure Ron Gurwitz (Received 28 January 2012; accepted 21 April 2012; published online 9 May 2012) A wurtzite GaAs epilayer photovoltage spectroscopy. The wurtzite structure of the epilayer is disclosed by scanning electron microscope

  20. Band offsets at zincblende-wurtzite GaAs nanowire sidewall surfaces P. Capiod,1

    E-Print Network [OSTI]

    Dunin-Borkowski, Rafal E.

    Band offsets at zincblende-wurtzite GaAs nanowire sidewall surfaces P. Capiod,1 T. Xu,1,2 J. P. Nys of zincblende (ZB)-wurtzite (WZ) GaAs nanowires are investigated by scanning tunneling spectroscopy and density inclusions consisting of zinc-blende (ZB) and wurtzite (WZ) segments form during the growth of NWs and where

  1. KrF-laser annealing of native oxides on GaAs

    SciTech Connect (OSTI)

    Ahrenkiel, R.K.; Anderson, G.; Dunlavy, D.; Maggiore, C.; Hammond, R.B.; Stotlar, S.

    1980-01-01T23:59:59.000Z

    Annealing of native oxides grown on GaAs has been performed using a pulsed KrF laser. This process allows the oxides to be heated to temperatures well above 350/sup 0/C without arsenic loss from the GaAs substrate. The physical, chemical, and electronic properties of the oxide are markedly changed by laser processing.

  2. Crack formation in GaAs heteroepitaxial films on Si and SiGe virtual substrates

    E-Print Network [OSTI]

    Crack formation in GaAs heteroepitaxial films on Si and SiGe virtual substrates V. K. Yang, MAs films grown on Si and SiGe virtual substrates analytically and experimentally. The analytical model­10 Relaxed SiGe graded layers on Si have produced the highest quality GaAs on Si to date for the integration

  3. (Polyfluoroaryl) fluoroanions of aluminum, gallium, and indium of enhanced utility, uses thereof, and products based thereon

    DOE Patents [OSTI]

    Marks, Tobin J. (Evanston, IL); Chen, You-Xian (Midland, MI)

    2002-01-01T23:59:59.000Z

    The (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium are novel weakly coordinating anions which are highly fluorinated. (Polyfluoroaryl)fluoroanions of one such type contain at least one ring substituent other than fluorine. These (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium have greater solubility in organic solvents, or have a coordinative ability essentially equal to or less than that of the corresponding (polyfluoroaryl)fluoroanion of aluminum, gallium, or indium in which the substituent is replaced by fluorine. Another type of new (polyfluoroaryl)fluoroanion of aluminum, gallium, and indium have 1-3 perfluorinated fused ring groups and 2-0 perfluorophenyl groups. When used as a cocatalyst in the formation of novel catalytic complexes with d- or f-block metal compounds having at least one leaving group such as a methyl group, these anions, because of their weak coordination to the metal center, do not interfere in the ethylene polymerization process, while affecting the propylene process favorably, if highly isotactic polypropylene is desired. Thus, the (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium of this invention are useful in various polymerization processes such as are described.

  4. (Polyfluoroaryl) fluoroanions of aluminum, gallium, and indium of enhanced utility, uses thereof, and products based thereon

    DOE Patents [OSTI]

    Marks, Tobin J. (Evanston, IL); Chen, You-Xian (Midland, MI)

    2001-01-01T23:59:59.000Z

    The (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium are novel weakly coordinating anions which are highly fluorinated. (Polyfluoroaryl)fluoroanions of one such type contain at least one ring substituent other than fluorine. These (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium have greater solubility in organic solvents, or have a coordinative ability essentially equal to or less than that of the corresponding (polyfluoroaryl)fluoroanion of aluminum, gallium, or indium in which the substituent is replaced by fluorine. Another type of new (polyfluoroaryl)fluoroanion of aluminum, gallium, and indium have 1-3 perfluorinated fused ring groups and 2-0 perfluorophenyl groups. When used as a cocatalyst in the formation of novel catalytic complexes with d- or f-block metal compounds having at least one leaving group such as a methyl group, these anions, because of their weak coordination to the metal center, do not interfere in the ethylene polymerization process, while affecting the propylene process favorably, if highly isotactic polypropylene is desired. Thus, the (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium of this invention are useful in various polymerization processes such as are described.

  5. The design, construction, and testing of a nuclear fuel rod thermal simulation system to study gallium/Zircaloy interactions

    E-Print Network [OSTI]

    Allison, Christopher Curtis

    1999-01-01T23:59:59.000Z

    The presence of gallium in weapons grade plutonium has raised many questions concerning its use in light water reactor (LWR) fuel rods. The biggest concern is that the gallium will migrate down the thermal gradient in the fuel rod and deposit...

  6. Electron backscatter diffraction of plutonium-gallium alloys

    SciTech Connect (OSTI)

    Boehlert, C. J. (Carl J.); Zocco, T. G. (Thomas G.); Schulze, R. K. (Roland K.); Mitchell, J. N. (Jeremy N.); Pereyra, R. A. (Ramiro A.)

    2002-01-01T23:59:59.000Z

    At Los Alamos National Laboratory a recent experimental technique has been developed to characterize reactive metals, including plutonium arid cerium, using electron backscatter diffraction (EBSD). Microstructural characterization of plutonium and its alloys by EBSD had been previously elusive primarily because of the extreme toxicity and rapid surface oxidation rate associated with plutonium metal. The experimental techniques, which included ion-sputtering the metal surface using a scanning auger microprobe (SAM) followed by vacuum transfer of the sample from the SAM to the scanning electron microscope (SEM), used to obtain electron backscatter diffraction Kikuchi patterns (EBSPs) and orientation maps for plutonium-gallium alloys are described and the initial microstructural observations based on the analysis are discussed. Combining the SEM and EBSD observations, the phase transformation behavior between the {delta} and {var_epsilon} structures was explained. This demonstrated sample preparation and characterization technique is expected to be a powerful means to further understand phase transformation behavior, orientation relationships, and texlure in the complicated plutonium alloy systems.

  7. Back contacted and small form factor GAAS solar cell.

    SciTech Connect (OSTI)

    Clews, Peggy Jane; Wanlass, Mark W. (National Renewable Energy Laboratory); Sanchez, Carlos A.; Pluym, Tammy; Cruz-Campa, Jose Luis; Okandan, Murat; Gupta, Vipin P.; Nielson, Gregory N.; Resnick, Paul James

    2010-06-01T23:59:59.000Z

    We present a newly developed microsystem enabled, back-contacted, shade-free GaAs solar cell. Using microsystem tools, we created sturdy 3 {micro}m thick devices with lateral dimensions of 250 {micro}m, 500 {micro}m, 1 mm, and 2 mm. The fabrication procedure and the results of characterization tests are discussed. The highest efficiency cell had a lateral size of 500 {micro}m and a conversion efficiency of 10%, open circuit voltage of 0.9 V and a current density of 14.9 mA/cm{sup 2} under one-sun illumination.

  8. Quantum effects in electron beam pumped GaAs

    SciTech Connect (OSTI)

    Yahia, M. E. [Faculty of Engineering, The British University in Egypt (BUE), El-Shorouk City, Cairo (Egypt) [Faculty of Engineering, The British University in Egypt (BUE), El-Shorouk City, Cairo (Egypt); National Institute of Laser Enhanced Sciences (NILES), Cairo University (Egypt); Azzouz, I. M. [National Institute of Laser Enhanced Sciences (NILES), Cairo University (Egypt)] [National Institute of Laser Enhanced Sciences (NILES), Cairo University (Egypt); Moslem, W. M. [Department of Physics, Faculty of Science, Port Said University, Port Said (Egypt)] [Department of Physics, Faculty of Science, Port Said University, Port Said (Egypt)

    2013-08-19T23:59:59.000Z

    Propagation of waves in nano-sized GaAs semiconductor induced by electron beam are investigated. A dispersion relation is derived by using quantum hydrodynamics equations including the electrons and holes quantum recoil effects, exchange-correlation potentials, and degenerate pressures. It is found that the propagating modes are instable and strongly depend on the electron beam parameters, as well as the quantum recoil effects and degenerate pressures. The instability region shrinks with the increase of the semiconductor number density. The instability arises because of the energetic electron beam produces electron-hole pairs, which do not keep in phase with the electrostatic potential arising from the pair plasma.

  9. Evolution Of Surface Topography On GaAs(100) And GaAs(111) At Normal And Oblique Incidence Of Ar{sup +}-Ions

    SciTech Connect (OSTI)

    Venugopal, V.; Basu, T.; Garg, S.; Majumder, S.; Sarangi, S. N.; Som, T. [Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005 (India); Das, P.; Bhattacharyya, S. R.; Chini, T. K. [Surface Physics Division, Saha Institute of Nuclear Physics, Kolkata 700 064 (India)

    2010-10-04T23:59:59.000Z

    Nanoscale surface structures emerging from medium energy (50-60 keV)Ar{sup +}-ion sputtering of p-type GaAs(100) and semi-insulating GaAs(111) substrates have been investigated. For normally incident 50 keV Ar{sup +}-ions of fluence 1x10{sup 17} ions/cm{sup 2} on GaAs(100) and GaAs(111) features in the form of nanoscale pits/holes without short range ordering are observed with densities 5.2x10{sup 9} /cm{sup 2} and 5.9x10{sup 9} /cm{sup 2}, respectively along with irregularly shaped patches of islands. For GaAs(111) on increasing the influence to 5x10{sup 17} /cm{sup 2} the pit density increases marginally to 6.2x10{sup 9} /cm{sup 2}. For 60 deg. off-normal incidence of 60 keV Ar.{sup +}-ions of fluence 2x10{sup 17} ions/cm{sup 2} on GaAs(100) microscale wavelike surface topography is observed. In all cases well-defined nanodots are absent on the surface.

  10. NREL preprints for the 23rd IEEE Photovoltaic Specialists Conference

    SciTech Connect (OSTI)

    Fitzgerald, M. [ed.

    1993-05-01T23:59:59.000Z

    Topics covered include various aspects of solar cell fabrication and performance. Aluminium-gallium arsenides, cadmium telluride, amorphous silicon, and copper-indium-gallium selenides are all characterized in their applicability in solar cells.

  11. Crystal chemistry and self-lubricating properties of monochalcogenides gallium selenide and tin selenide

    SciTech Connect (OSTI)

    Erdemir, A.

    1993-02-01T23:59:59.000Z

    This paper describes the fundamentals of the crystal chemistry and self-lubricating mechanisms of two monochalcogenides; tin selenide and gallium selenide. Specifically, it enumerates their inter-atomic array and bond structure in crystalline states, and correlates this fundamental knowledge with their self-lubricating capacity. Friction tests assessing the self-lubricating performance of gallium and tin selenides were carried out on a pin-on-disk machine. Specifically, large crystalline pieces of gallium selenide and tin selenide were cut and cleaved into flat squares and subsequently rubbed against the sapphire balls. In another case, the fine powders (particle size {approx} 50--100 {mu}m) of gallium selenide and tin selenide were manually fed into the sliding interfaces of 440C pins and 440C disks. For the specific test conditions explored, it was found that the friction coefficients of the sapphire/gallium selenide and sapphire/tin selenide pairs were {approx} 0.23 and {approx} 0.35, respectively. The friction coefficients of 440C pin/440C disk test pairs with gallium selenide and tin selenide powders were on the orders of {approx} 0.22 and {approx} 0.38, respectively. For comparison, a number of parallel friction tests were performed with MoS{sub 2} powders and compacts and the results of these tests were also reported. The friction data together with the crystal-chemical knowledge and the electron microscopic evidence supported the conclusion that the lubricity and self-lubricating mechanisms of these solids are closely related to their crystal chemistry and the nature of interlayer bonding.

  12. Results of the Gallium-Clad Phase 3 and Phase 4 tasks (canceled prior to completion)

    SciTech Connect (OSTI)

    Morris, R.N.

    1998-08-01T23:59:59.000Z

    This report summarizes the results of the Gallium-Clad interactions Phase 3 and 4 tasks. Both tasks were to involve examining the out-of-pile stability of residual gallium in short fuel rods with an imposed thermal gradient. The thermal environment was to be created by an electrical heater in the center of the fuel rod and coolant flow on the rod outer cladding. Both tasks were canceled due to difficulties with fuel pellet fabrication, delays in the preparation of the test apparatus, and changes in the Fissile Materials Disposition program budget.

  13. Percolation of gallium dominates the electrical resistance of focused ion beam deposited metals

    SciTech Connect (OSTI)

    Faraby, H. [Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, California 92093 (United States); DiBattista, M. [Qualcomm Technologies Incorporated, San Diego, California 92121 (United States); Bandaru, P. R., E-mail: pbandaru@ucsd.edu [Department of Mechanical and Aerospace Engineering, University of California, San Diego, La Jolla, California 92093 (United States)

    2014-04-28T23:59:59.000Z

    Metal deposition through focused ion beam (FIB) based systems is thought to result in material composed of the primary metal from the metallo-organic precursor in addition to carbon, oxygen, and gallium. We determined, through electrical resistance and chemical composition measurements on a wide range of FIB deposited platinum and tungsten lines, that the gallium ion (Ga{sup +}) concentration in the metal lines plays the dominant role in controlling the electrical resistivity. Effective medium theory, based on McLachlan's formalisms, was used to describe the relationship between the Ga{sup +} concentration and the corresponding resistivity.

  14. In vitro bio-functionality of gallium nitride sensors for radiation biophysics

    SciTech Connect (OSTI)

    Hofstetter, Markus [Helmholtz Zentrum Muenchen, German Research Center for Environmental Health, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany)] [Helmholtz Zentrum Muenchen, German Research Center for Environmental Health, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany); Howgate, John [Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching (Germany)] [Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching (Germany); Schmid, Martin [Helmholtz Zentrum Muenchen, German Research Center for Environmental Health, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany)] [Helmholtz Zentrum Muenchen, German Research Center for Environmental Health, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany); Schoell, Sebastian; Sachsenhauser, Matthias [Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching (Germany)] [Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching (Germany); Adiguezel, Denis [Helmholtz Zentrum Muenchen, German Research Center for Environmental Health, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany)] [Helmholtz Zentrum Muenchen, German Research Center for Environmental Health, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany); Stutzmann, Martin; Sharp, Ian D. [Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching (Germany)] [Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching (Germany); Thalhammer, Stefan, E-mail: stefan.thalhammer@helmholtz-muenchen.de [Helmholtz Zentrum Muenchen, German Research Center for Environmental Health, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany)] [Helmholtz Zentrum Muenchen, German Research Center for Environmental Health, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany)

    2012-07-27T23:59:59.000Z

    Highlights: Black-Right-Pointing-Pointer Gallium nitride based sensors show promising characteristics to monitor cellular parameters. Black-Right-Pointing-Pointer Cell growth experiments reveal excellent biocompatibiltiy of the host GaN material. Black-Right-Pointing-Pointer We present a biofunctionality assay using ionizing radiation. Black-Right-Pointing-Pointer DNA repair is utilized to evaluate material induced alterations in the cellular behavior. Black-Right-Pointing-Pointer GaN shows no bio-functional influence on the cellular environment. -- Abstract: There is an increasing interest in the integration of hybrid bio-semiconductor systems for the non-invasive evaluation of physiological parameters. High quality gallium nitride and its alloys show promising characteristics to monitor cellular parameters. Nevertheless, such applications not only request appropriate sensing capabilities but also the biocompatibility and especially the biofunctionality of materials. Here we show extensive biocompatibility studies of gallium nitride and, for the first time, a biofunctionality assay using ionizing radiation. Analytical sensor devices are used in medical settings, as well as for cell- and tissue engineering. Within these fields, semiconductor devices have increasingly been applied for online biosensing on a cellular and tissue level. Integration of advanced materials such as gallium nitride into these systems has the potential to increase the range of applicability for a multitude of test devices and greatly enhance sensitivity and functionality. However, for such applications it is necessary to optimize cell-surface interactions and to verify the biocompatibility of the semiconductor. In this work, we present studies of mouse fibroblast cell activity grown on gallium nitride surfaces after applying external noxa. Cell-semiconductor hybrids were irradiated with X-rays at air kerma doses up to 250 mGy and the DNA repair dynamics, cell proliferation, and cell growth dynamics of adherent cells were compared to control samples. The impact of ionizing radiation on DNA, along with the associated cellular repair mechanisms, is well characterized and serves as a reference tool for evaluation of substrate effects. The results indicate that gallium nitride does not require specific surface treatments to ensure biocompatibility and suggest that cell signaling is not affected by micro-environmental alterations arising from gallium nitride-cell interactions. The observation that gallium nitride provides no bio-functional influence on the cellular environment confirms that this material is well suited for future biosensing applications without the need for additional chemical surface modification.

  15. Millimeter wave ferromagnetic resonance in gallium-substituted ?-iron oxide

    SciTech Connect (OSTI)

    Chao, Liu, E-mail: liu.chao@tufts.edu; Afsar, Mohammed N. [Department of Electrical and Computer Engineering, Tufts University, Medford, Massachusetts 02155 (United States); Ohkoshi, Shin-ichi [Department of Chemistry, School of Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

    2014-05-07T23:59:59.000Z

    In millimeter wave frequency range, hexagonal ferrites with high uniaxial anisotropic magnetic fields are used as absorbers. These ferrites include M-type barium ferrite (BaFe{sub 12}O{sub 19}) and strontium ferrite (SrFe{sub 12}O{sub 19}), which have natural ferromagnetic resonant frequency range from 40 GHz to 60?GHz. However, the higher frequency range lacks suitable materials that support the higher frequency ferromagnetic resonance. A new series of gallium-substituted ?-iron oxides (?-Ga{sub x}Fe{sub 2?x}O{sub 3}) are synthesized which have ferromagnetic resonant frequencies appearing over the frequency range 30 GHz–150 GHz. The ?-Ga{sub x}Fe{sub 2?x}O{sub 3} is synthesized by the combination of reverse micelle and sol-gel techniques or the sol-gel method only. The particle sizes are observed to be smaller than 100 nm. In this paper, the free space magneto-optical approach has been employed to study these newly developed ?-Ga{sub x}Fe{sub 2?x}O{sub 3} particles in millimeter waves. This technique enables to obtain precise transmission spectra to determine the dielectric and magnetic properties of both isotropic and anisotropic ferrites in the millimeter wave frequency range from a single set of direct measurements. The transmittance and absorbance spectra of ?-Ga{sub x}Fe{sub 2?x}O{sub 3} are shown in this paper. Strong ferromagnetic resonances at different frequencies determined by the x parameter are found.

  16. Gallium-cladding compatibility testing plan: Phase 3 -- Test plan for centrally heated surrogate rodlet test. Revision 2

    SciTech Connect (OSTI)

    Morris, R.N.; Baldwin, C.A.; Wilson, D.F.

    1998-07-01T23:59:59.000Z

    The Fissile Materials Disposition Program (FMDP) is investigating the use of weapons grade plutonium in mixed oxide (MOX) fuel for light-water reactors (LWR). Commercial MOX fuel has been successfully used in overseas reactors for many years; however, weapons derived fuel may differ from the previous commercial fuels because of small amounts of gallium impurities. A concern presently exists that the gallium may migrate out of the fuel, react with and weaken the clad, and thereby promote loss of fuel pin integrity. Phases 1 and 2 of the gallium task are presently underway to investigate the types of reactions that occur between gallium and clad materials. This is a Level-2 document as defined in the Fissile Materials Disposition Program Light-Water Reactor Mixed-Oxide Fuel Irradiation Test Project Plan. This Plan summarizes the projected Phase 3 Gallium-Cladding compatibility heating test and the follow-on post test examination (PTE). This work will be performed using centrally-heated surrogate pellets, to avoid unnecessary complexities and costs associated with working with plutonium and an irradiation environment. Two sets of rodlets containing pellets prepared by two different methods will be heated. Both sets will have an initial bulk gallium content of approximately 10 ppm. The major emphasis of the PTE task will be to examine the material interactions, particularly indications of gallium transport from the pellets to the clad.

  17. High-efficiency solar cell and method for fabrication

    DOE Patents [OSTI]

    Hou, H.Q.; Reinhardt, K.C.

    1999-08-31T23:59:59.000Z

    A high-efficiency 3- or 4-junction solar cell is disclosed with a theoretical AM0 energy conversion efficiency of about 40%. The solar cell includes p-n junctions formed from indium gallium arsenide nitride (InGaAsN), gallium arsenide (GaAs) and indium gallium aluminum phosphide (InGaAlP) separated by n-p tunnel junctions. An optional germanium (Ge) p-n junction can be formed in the substrate upon which the other p-n junctions are grown. The bandgap energies for each p-n junction are tailored to provide substantially equal short-circuit currents for each p-n junction, thereby eliminating current bottlenecks and improving the overall energy conversion efficiency of the solar cell. Additionally, the use of an InGaAsN p-n junction overcomes super-bandgap energy losses that are present in conventional multi-junction solar cells. A method is also disclosed for fabricating the high-efficiency 3- or 4-junction solar cell by metal-organic chemical vapor deposition (MOCVD). 4 figs.

  18. High-efficiency solar cell and method for fabrication

    DOE Patents [OSTI]

    Hou, Hong Q. (Albuquerque, NM); Reinhardt, Kitt C. (Albuquerque, NM)

    1999-01-01T23:59:59.000Z

    A high-efficiency 3- or 4-junction solar cell is disclosed with a theoretical AM0 energy conversion efficiency of about 40%. The solar cell includes p-n junctions formed from indium gallium arsenide nitride (InGaAsN), gallium arsenide (GaAs) and indium gallium aluminum phosphide (InGaAlP) separated by n-p tunnel junctions. An optional germanium (Ge) p-n junction can be formed in the substrate upon which the other p-n junctions are grown. The bandgap energies for each p-n junction are tailored to provide substantially equal short-circuit currents for each p-n junction, thereby eliminating current bottlenecks and improving the overall energy conversion efficiency of the solar cell. Additionally, the use of an InGaAsN p-n junction overcomes super-bandgap energy losses that are present in conventional multi-junction solar cells. A method is also disclosed for fabricating the high-efficiency 3- or 4-junction solar cell by metal-organic chemical vapor deposition (MOCVD).

  19. Research directions and progress in the SERI advanced high efficiency concept program

    SciTech Connect (OSTI)

    Cole, L.A.; Benner, J.P.

    1984-06-01T23:59:59.000Z

    The inherent electro-optical properties of gallium arsenide (GaAs) and related III-V compounds make this class of semiconductors an optimum choice for use in very high efficiency solar cells. The ability to alloy GaAs with other column III and V elements while maintaining the single crystal zincblende structure allows the photovoltaic properties to be tailored to specific needs. The current understanding and control of the properties of these materials is more advanced than for any other semiconductor except single crystal silicon. For these reasons, the Advanced High Efficiency Concepts Program supports materials research to improve the properties of III-V semiconductors needed to achieve the maximum attainable photovoltaic conversion efficiencies.

  20. Development and modeling of iron-gallium alloys Rick Allen Kellogg

    E-Print Network [OSTI]

    Flatau, Alison B.

    Development and modeling of iron-gallium alloys by Rick Allen Kellogg A dissertation submitted APPENDIX C: POISSON'S RATIOS OF Fe-Al ALLOYS 154 REFERENCES 155 #12;iv ACKNOWLEDGEMENTS Many people deserve University and the Department of Aerospace Engineering and Engineering Mechanics for providing academic

  1. Diffusion of indium and gallium in Cu(In,Ga)Se2 thin film solar cells

    E-Print Network [OSTI]

    Rockett, Angus

    conversion efficiency of solar cells made from this material [1]. One of the special qualities of the CIGS improve the solar cell performance. In many of the different CIGS fabrication techniques, an in depthDiffusion of indium and gallium in Cu(In,Ga)Se2 thin film solar cells O. Lundberga,*, J. Lua , A

  2. ELECTRON MICROPROBE AND PHOTOLUMINESCENCE ANALYSIS OF EUROPIUM-DOPED GALLIUM NITRIDE LIGHT EMITTERS

    E-Print Network [OSTI]

    Strathclyde, University of

    ELECTRON MICROPROBE AND PHOTOLUMINESCENCE ANALYSIS OF EUROPIUM-DOPED GALLIUM NITRIDE LIGHT EMITTERSN-on-sapphire epilayers implanted with Europium ions, producing characteristic red emission lines between 540 and 680 nm with energies largely independent of the host material. For example, doping with europium, erbium and thulium

  3. Synthesis, Structures, and Magnetic Properties of Rare-Earth Cobalt Arsenides, RCo2As2 (R = La, Ce, Pr, Nd)

    SciTech Connect (OSTI)

    Thompson, Corey [Florida State University, Tallahassee] [Florida State University, Tallahassee; Tan, Xiaoyan [Florida State University, Tallahassee] [Florida State University, Tallahassee; Kovnir, Kirill [Florida State University, Tallahassee] [Florida State University, Tallahassee; Garlea, Vasile O [ORNL] [ORNL; Shatruk, Michael [Florida State University, Tallahassee] [Florida State University, Tallahassee

    2014-01-01T23:59:59.000Z

    Four rare-earth cobalt arsenides, RCo2As2 (R = La, Ce, Pr, Nd), were obtained by reactions of constituent elements in molten Bi. The use of Bi flux also allowed the growth of representative single crystals. All compounds are isostructural and belong to the ThCr2Si2 structure type (space group I4/mmm). The formation of Co vacancies is observed in all structures, while the structures of La- and Ce-containing compounds also show incorporation of minor Bi defects next to the R crystallographic site. Correspondingly, the general formula of these materials can be written as R1 xBixCo2 As2, with x/ = 0.03/0.1, 0.05/0.15, 0/0.2, and 0/0.3 for R = La, Ce, Pr, and Nd, respectively. All compounds exhibit high-temperature ferromagnetic ordering of Co magnetic moments in the range of 150-200 K. Electronic band structure calculations revealed a high peak in the density of states at the Fermi level, thus supporting the itinerant nature of magnetism in the Co sublattice. The magnetic ordering in the lanthanide sublattice takes place at lower temperatures, with the R moments aligning antiparallel to the Co moments to give a ferrimagnetic ground state. The measurements on oriented single crystals demonstrated significant magnetic anisotropy in the ferrimagnetic state, with the preferred moment alignment along the c axis of the tetragonal lattice. Neutron powder diffraction failed to reveal the structure of magnetically ordered states, but confirmed the presence of Co vacancies. X-ray absorption near-edge structure spectroscopy on Ce1.95Bi0.05Co1.85As2 showed the average oxidation state of Ce to be +3.06. Solid state NMR spectroscopy revealed a substantially reduced hyperfine field on the Co atoms in the vicinity of Bi defects.

  4. Terahertz waveguide spectroscopy of two-dimensional plasmons in GaAs

    E-Print Network [OSTI]

    Harris, C. Thomas (Charles Thomas)

    2010-01-01T23:59:59.000Z

    The electrical characteristics of high-mobility, two-dimensional electron gas (2DEG) systems, such as GaAs quantum wells, have been well-studied at low frequencies and in extreme conditions of high magnetic fields and ...

  5. Exciton localization mechanisms in wurtzite/zinc-blende GaAs nanowires

    E-Print Network [OSTI]

    Graham, Alexandra; Corfdir, Pierre; Heiss, Martin; Conesa-Boj, Sonia; Uccelli, Emanuele; Fontcuberta i Morral, Anna; Phillips, Richard

    We investigate the emission properties of excitons in GaAs nanowires containing quantum disks formed by structural alternation between the zinc-blende and wurtzite phases, by means of temperature-dependent photoluminescence. At 10 K the emission...

  6. Preconceptual design for separation of plutonium and gallium by ion exchange

    SciTech Connect (OSTI)

    DeMuth, S.F.

    1997-09-30T23:59:59.000Z

    The disposition of plutonium from decommissioned nuclear weapons, by incorporation into commercial UO{sub 2}-based nuclear reactor fuel, is a viable means to reduce the potential for theft of excess plutonium. This fuel, which would be a combination of plutonium oxide and uranium oxide, is referred to as a mixed oxide (MOX). Following power generation in commercial reactors with this fuel, the remaining plutonium would become mixed with highly radioactive fission products in a spent fuel assembly. The radioactivity, complex chemical composition, and large size of this spent fuel assembly, would make theft difficult with elaborate chemical processing required for plutonium recovery. In fabricating the MOX fuel, it is important to maintain current commercial fuel purity specifications. While impurities from the weapons plutonium may or may not have a detrimental affect on the fuel fabrication or fuel/cladding performance, certifying the effect as insignificant could be more costly than purification. Two primary concerns have been raised with regard to the gallium impurity: (1) gallium vaporization during fuel sintering may adversely affect the MOX fuel fabrication process, and (2) gallium vaporization during reactor operation may adversely affect the fuel cladding performance. Consequently, processes for the separation of plutonium from gallium are currently being developed and/or designed. In particular, two separation processes are being considered: (1) a developmental, potentially lower cost and lower waste, thermal vaporization process following PuO{sub 2} powder preparation, and (2) an off-the-shelf, potentially higher cost and higher waste, aqueous-based ion exchange (IX) process. While it is planned to use the thermal vaporization process should its development prove successful, IX has been recommended as a backup process. This report presents a preconceptual design with material balances for separation of plutonium from gallium by IX.

  7. X-ray photoelectron spectroscopy of gallium nitride films grown by radical-beam gettering epitaxy

    SciTech Connect (OSTI)

    Rogozin, I. V. [Berdyansk State Pedagogical University (Ukraine)], E-mail: rogozin@bdpu.org; Kotlyarevsky, M. B. [Academy of Management and Information Technology (Ukraine)

    2007-05-15T23:59:59.000Z

    Thin GaN films were grown on GaAs(111) substrates by radical-beam gettering epitaxy. The structural quality of the films was studied by high-resolution x-ray diffraction. The chemical composition of the GaAs surface and GaN film was studied by x-ray photoelectron spectroscopy. It is shown that Ga-N and As-N bonds are formed on the GaAs surface at initial growth stages at low temperatures. The state of the film-substrate interface was studied. It was found that prolonged annealing of GaN films in nitrogen radicals shifts the composition to nitrogen excess.

  8. Molecular Dynamics Simulation of GaAs Molecular Beam Epitaxy D. A. Murdick,1

    E-Print Network [OSTI]

    Wadley, Haydn

    of Virginia, Charlottesville, Virginia 22904, USA 2 Department of Materials, University of Oxford, Oxford OX1 3PH, UK ABSTRACT The vapor deposition of epitaxial GaAs and (Ga,Mn)As thin films during far-temperature growth of Ga0.94Mn0.06As and the Mn clustering trends in as-grown films. INTRODUCTION GaAs is widely used

  9. A study of microstrip T-juction discontinuity effects and modeling on GAAS substrates

    E-Print Network [OSTI]

    Guill, Dennis Jarrett

    1999-01-01T23:59:59.000Z

    A STUDY OF MICROSTRIP T-JUNCTION DISCONTINUITY EFFECTS AND MODELING ON GAAS SUBSTRATES A Thesis by DENNIS JARRET GUILL IR. Submitted to the Office of Graduate Studies of Texas A&M University in partial fulfillment of the requirements... for the degree of MASTER OF SCIENCE December 1999 Major Subject: Electrical Engineering A STUDY OF MICROSTRIP T-JUNCTION DISCONTINUITY EFFECTS AND MODELING ON GAAS SUBSTRATES A Thesis by DENNIS JARRET GUILL JR. Submitted to Texas A&M University...

  10. Development of high-efficiency GaAs solar cells on polycrystalline Ge substrates

    SciTech Connect (OSTI)

    Venkatasubramanian, R.; OQuinn, B.; Hills, J.; Malta, D.; Timmons, M.L.; Hutchby, J.A. [Research Triangle Institute, Research Triangle Park, North Carolina 27709 (United States); Ahrenkiel, R.; Keyes, B.M. [National Renewable Energy Laboratory, Golden, Colorado 80401 (United States)

    1996-01-01T23:59:59.000Z

    Progress in the development of high-efficiency GaAs solar cells on low-cost, large-area, large-grain, optical-grade polycrystalline Ge substrates is described in this paper. First, we present results on the growth of specular GaAs-AlGaAs layers, across the various crystalline orientations of a polycrystalline Ge substrate, by metallorganic chemical vapor deposition (MOCVD). Second, we present the preliminary optimization of minority-carrier properties of GaAs-AlGaAs structures on poly-Ge substrates towards the improvement of GaAs solar cells. We have demonstrated comparable minority-carrier lifetimes in GaAs double-hetero structures grown on optical-grade poly-Ge substrates and electronic-grade single-crystal Ge substrates. In addition, we describe device-structure optimization that have led us to achieve a open-circuit voltage of {approximately}1 Volt in a GaAs solar cell on poly-Ge and to improve our previous best efficiency from 15.8{percent} for a 1-cm{sup 2}-area GaAs cell to 16.7{percent} for a 4-cm{sup 2}-area GaAs solar cell on poly-Ge. {copyright} {ital 1996 American Institute of Physics.}

  11. This article has been accepted for inclusion in a future issue of this journal. Content is final as presented, with the exception of pagination. IEEE JOURNAL OF PHOTOVOLTAICS 1

    E-Print Network [OSTI]

    Atwater, Harry

    as presented, with the exception of pagination. IEEE JOURNAL OF PHOTOVOLTAICS 1 Gallium Arsenide Solar Cell--Gallium arsenide, nanospheres, photovoltaic systems, whispering gallery modes (WGMs). I. INTRODUCTION THE route as the active layer is thinned [2]. Thin-film photovoltaics offer the possibility to significantly reduce

  12. Osteomyelitis and infarction in sickle cell hemoglobinopathies: differentiation by combined technetium and gallium scintigraphy

    SciTech Connect (OSTI)

    Amundsen, T.R.; Siegel, M.J.; Siegel, B.A.

    1984-12-01T23:59:59.000Z

    Clinical records and scintigrams were reviewed of 18 patients with sickle cell hemoglobinophaties who had undergone combined technetium and gallium scintigraphy during 22 separate episodes of suspected osseous infection. The combined scintigrams were correctly interpreted as indicating osteomyelitis in four studies. Of 18 studies in patients with infarction, the combined scintigrams were correctly interpreted in 16 and showed either no local accumulation of Ga-67 or less accumulation than that of Tc-99m MDP at symptomatic sites. In the other two studies, the scintigrams were falsely interpreted as indicating osteomyelitis and showed congruent, increased accumulation of both Tc-99, MDP and Ga-67. This pattern must be considered indeterminate. Overall, the results indicate that the combination of technetium and gallium scintigraphy is an effective means to distinguish osteomyelitis from infarction in patients with sickle cell hemoglobinopathies.

  13. Fast neutron scattering on Gallium target at 14.8 MeV

    E-Print Network [OSTI]

    R. Han; R. Wada; Z. Chen; Y. Nie; X. Liu; S. Zhang; P. Ren; B. Jia; G. Tian; F. Luo; W. Lin; J. Liu; F. Shi; M. Huang; X. Ruan; J. Ren; Z. Zhou; H. Huang; J. Bao; K. Zhang; B. Hu

    2014-11-03T23:59:59.000Z

    Benchmarking of evaluated nuclear data libraries was performed for $\\sim 14.8$ MeV neutrons on Gallium targets. The experiments were performed at China Institute of Atomic Energy(CIAE). Solid samples of natural Gallium (3.2 cm and 6.4 cm thick) were bombarded by $\\sim 14.8$ MeV neutrons and leakage neutron energy spectra were measured at 60$^{\\circ}$ and 120$^{\\circ}$. The measured spectra are rather well reproduced by MCNP-4C simulations with the CENDL-3.1, ENDF/B-VII and JENDL-4.0 evaluated nuclear data libraries, except for the inelastic contributions around $E_{n} = 10-13$ MeV. All three libraries significantly underestimate the inelastic contributions. The inelastic contributions are further studied, using the Talys simulation code and the experimental spectra are reproduced reasonably well in the whole energy range by the Talys calculation, including the inelastic contributions.

  14. Distinctive Signature of Indium Gallium Nitride Quantum Dot Lasing in Microdisks Cavities

    E-Print Network [OSTI]

    Woolf, Alexander; Aharanovich, Igor; Zhu, Tongtong; Niu, Nan; Wang, Danqing; Oliver, Rachel A; Hu, Evelyn L

    2014-01-01T23:59:59.000Z

    Low threshold lasers realized within compact, high quality optical cavities enable a variety of nanophotonics applications. Gallium nitride (GaN) materials containing indium gallium nitride (InGaN) quantum dots and quantum wells offer an outstanding platform to study light matter interactions and realize practical devices such as efficient light emitting diodes and nanolasers. Despite progress in the growth and characterization of InGaN quantum dots, their advantages as the gain medium in low threshold lasers have not been clearly demonstrated. This work seeks to better understand the reasons for these limitations by focusing on the simpler, limited-mode microdisk cavities, and by carrying out comparisons of lasing dynamics in those cavities using varying gain media including InGaN quantum wells, fragmented quantum wells, and a combination of fragmented quantum wells with quantum dots. For each gain medium, we utilize the distinctive, high quality (Q~5500) modes of the cavities, and the change in the highest ...

  15. Fast neutron scattering on Gallium target at 14.8 MeV

    E-Print Network [OSTI]

    Han, R; Chen, Z; Nie, Y; Liu, X; Zhang, S; Ren, P; Jia, B; Tian, G; Luo, F; Lin, W; Liu, J; Shi, F; Huang, M; Ruan, X; Ren, J; Zhou, Z; Huang, H; Bao, J; Zhang, K; Hu, B

    2014-01-01T23:59:59.000Z

    Benchmarking of evaluated nuclear data libraries was performed for $\\sim 14.8$ MeV neutrons on Gallium targets. The experiments were performed at China Institute of Atomic Energy(CIAE). Solid samples of natural Gallium (3.2 cm and 6.4 cm thick) were bombarded by $\\sim 14.8$ MeV neutrons and leakage neutron energy spectra were measured at 60$^{\\circ}$ and 120$^{\\circ}$. The measured spectra are rather well reproduced by MCNP-4C simulations with the CENDL-3.1, ENDF/B-VII and JENDL-4.0 evaluated nuclear data libraries, except for the inelastic contributions around $E_{n} = 10-13$ MeV. All three libraries significantly underestimate the inelastic contributions. The inelastic contributions are further studied, using the Talys simulation code and the experimental spectra are reproduced reasonably well in the whole energy range by the Talys calculation, including the inelastic contributions.

  16. Interaction of hydrogen with gallium vacancies in wurtzite GaN

    SciTech Connect (OSTI)

    Wright, A. F.

    2001-08-01T23:59:59.000Z

    First-principles techniques are used to investigate the interaction of hydrogen with gallium vacancies in wurtzite GaN. The calculations reveal that hydrogen can either compensate a vacancy by donating an electron to a vacancy acceptor level, or passivate the vacancy by forming a hydrogen-vacancy complex. A gallium vacancy can bind up to four hydrogen atoms, and hydrogen removal energies are computed as a function of the number of hydrogen atoms. Removal energies are found to depend strongly on Fermi level and complexes containing more than two hydrogen atoms are predicted to be unstable in n-type GaN. Hydrogen vibration frequencies are computed and compared with previously reported infrared absorption measurements for hydrogen-implanted GaN.

  17. Growth of epitaxial iron nitride ultrathin film on zinc-blende gallium nitride

    SciTech Connect (OSTI)

    Pak, J.; Lin, W.; Wang, K.; Chinchore, A.; Shi, M.; Ingram, D. C.; Smith, A. R.; Sun, K.; Lucy, J. M.; Hauser, A. J.; Yang, F. Y. [Department of Physics and Astronomy, Nanoscale and Quantum Phenomena Institute, Ohio University, Athens, Ohio 45701 (United States); Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 (United States); Department of Physics, The Ohio State University, 191 Woodruff Avenue, Columbus, Ohio 43210 (United States)

    2010-07-15T23:59:59.000Z

    The authors report the growth of iron nitride on zinc-blende gallium nitride using molecular beam epitaxy. First, zinc-blende GaN is grown on a magnesium oxide substrate having (001) orientation; second, an ultrathin layer of FeN is grown on top of the GaN layer. In situ reflection high-energy electron diffraction is used to monitor the surface during growth, and a well-defined epitaxial relationship is observed. Cross-sectional transmission electron microscopy is used to reveal the epitaxial continuity at the gallium nitride-iron nitride interface. Surface morphology of the iron nitride, similar to yet different from that of the GaN substrate, can be described as plateau valley. The FeN chemical stoichiometry is probed using both bulk and surface sensitive methods, and the magnetic properties of the sample are revealed.

  18. Origin of color centers in the flux-grown europium gallium garnet

    SciTech Connect (OSTI)

    Aleksandrovsky, A. S.; Arkhipkin, V. G.; Bezmaternykh, L. N.; Gudim, I. A.; Krylov, A. S. [L. V. Kirensky Institute of Physics, Akademgorodok, Krasnoyarsk 660036, Russia and Siberian Federal University, Krasnoyarsk 660079 (Russian Federation); Vagizov, F. [Department of Physics, Texas A and M University, College Station, Texas 77840 (United States)

    2008-04-15T23:59:59.000Z

    Europium gallium garnet (EuGG) single crystals were grown from fluxes with various contents. Optical absorption spectra of EuGG grown from a flux containing calcium show an additional band in the ultraviolet and blue regions of the spectra as compared to the case of a calcium-free flux. Moessbauer spectra of the samples grown from the fluxes with different additives show no signs of other valence states of the europium ions except for 3+. However, they indicate changes in the crystal field due to the entrance of additive ions. The nature of the additional absorption must be the same as that for calcium-doped gadolinium gallium garnet, i.e., anion vacancies. Moessbauer isotope shifts and quadrupole splitting for EuGG are determined.

  19. Surface reconstructions of cubic gallium nitride ,,001... grown by radio frequency nitrogen plasma molecular beam epitaxy

    E-Print Network [OSTI]

    observed on c-GaN 001 , depending on the growth condi- tions and the substrate. For growth of c-GaN on Ga-rich-grown GaN 001 on MgO 001 substrate. We have deduced that these variant reconstructions are com- posed of Ga; published online 27 October 2006 Cubic GaN has been grown under gallium Ga -rich growth conditions using

  20. Gallium suboxide vapor attack on chromium, cobalt, molybdenum, tungsten and their alloys at 1200 [degrees] C

    SciTech Connect (OSTI)

    Kolman, D. G. (David G.); Taylor, T. N. (Thomas N.); Park, Y. (Youngsoo); Stan, M. (Marius); Butt, D. P. (Darryl P.); Maggiore, C. J. (Carl J.); Tesmer, Joseph R.; Havrilla, G. J. (George J.)

    2004-01-01T23:59:59.000Z

    Our prior work elucidated the failure mechanism of furnace materi als (304 SS, 316 SS, and Hastelloy C-276) exposed to gallium suboxide (Ga{sub 2}O) and/or gallium oxide (Ga{sub 2}O{sub 3}) during plutonium - gallium compound processing. Failure was hypothesized to result from concurrent alloy oxidation/Ga compound reduction followed by Ga uptake. The aim of the current work is to screen candidate replacement materials. Alloys Haynes 25 (49 Co - 20 Cr - 15 W - 10 Ni - 3 Fe - 2 Mn - 0.4 Si, wt%), 52 Mo - 48 Re (wt%), 62 W - 38 Cu (wt%), and commercially pure Cr, Co, Mo, W, and alumina were examined. Preliminary assessments of commercially pure W and Mo - Re suggest that these materials may be suitable for furnace construction. Thermodynamics calculations indicating that materials containing Al, Cr, Mn, Si, and V would be susceptible to oxidation in the presence of Ga{sub 2}O were validated by experimental results. In contrast to that reported previously, an alternate reaction mechanism for Ga uptake, which does not require concurrent alloy oxidation, controls Ga uptake for certain materials. A correlation between Ga solubility and uptake was noted.

  1. Preparation of gallium nitride surfaces for atomic layer deposition of aluminum oxide

    SciTech Connect (OSTI)

    Kerr, A. J. [Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, California 92093 (United States); Department of Chemistry and Biochemistry, University of California, San Diego, La Jolla, California 92093 (United States); Chagarov, E.; Kaufman-Osborn, T.; Kummel, A. C., E-mail: akummel@ucsd.edu [Department of Chemistry and Biochemistry, University of California, San Diego, La Jolla, California 92093 (United States); Gu, S.; Wu, J.; Asbeck, P. M. [Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, California 92093 (United States); Madisetti, S.; Oktyabrsky, S. [Department of Nanoscale Science and Engineering, University at Albany–State University of New York, Albany, New York 12222 (United States)

    2014-09-14T23:59:59.000Z

    A combined wet and dry cleaning process for GaN(0001) has been investigated with XPS and DFT-MD modeling to determine the molecular-level mechanisms for cleaning and the subsequent nucleation of gate oxide atomic layer deposition (ALD). In situ XPS studies show that for the wet sulfur treatment on GaN(0001), sulfur desorbs at room temperature in vacuum prior to gate oxide deposition. Angle resolved depth profiling XPS post-ALD deposition shows that the a-Al{sub 2}O{sub 3} gate oxide bonds directly to the GaN substrate leaving both the gallium surface atoms and the oxide interfacial atoms with XPS chemical shifts consistent with bulk-like charge. These results are in agreement with DFT calculations that predict the oxide/GaN(0001) interface will have bulk-like charges and a low density of band gap states. This passivation is consistent with the oxide restoring the surface gallium atoms to tetrahedral bonding by eliminating the gallium empty dangling bonds on bulk terminated GaN(0001)

  2. Metal-insulator-semiconductor structures on p-type GaAs with low interface state density

    E-Print Network [OSTI]

    Chen, Zhi

    Metal-insulator-semiconductor structures on p-type GaAs with low interface state density Zhi Chen properties of in situ deposited Si3N4 /Si/p-GaAs metal-insulator-semiconductor structures have been offered by a low gate leakage technology in GaAs, such as metal insulator structures, func- tional Ga

  3. Gallium-67 complexes as radioactive markers to assess gastric and colonic transit

    SciTech Connect (OSTI)

    Bellen, J.C.; Chatterton, B.E.; Penglis, S.; Tsopelas, C. [Royal Adelaide Hospital (Australia)

    1995-03-01T23:59:59.000Z

    Constipation and gastroparesis are gastrointestinal tract disorders that can be assessed by using radioactive markers in conjunction with scintigraphic techniques. Indium-111-DTPA is the radiopharmaceutical of choice for treating colonic transit in constipated patients, but it is an expensive product and its availability has been unreliable. Indium-113m-DTPA was the tracer used in our study to determine the liquid gastric emptying rate in dual-isotope solid-liquid emptying studies, however, cessation of the {sup 113}Sn/{sup 113m}In generator production makes it unavailable. Thus, development of alternative tracers to {sup 111}In-DTPA and {sup 113m}In-DTPA was essential. Gallium-67-citrate and {sup 67}Ga-EDTA were compared to {sup 111}In-DTPA to assess their efficacy for exclusive retention in the GI tract. These markers were orally administered into rats and their three-day cumulative fecal excretion, urine excretion and carcass retention were measured. An in vitro gastric emptying model was used to determine liquid phase partitioning of {sup 113m}In-DTPA, {sup 67}Ga-citrate and {sup 67}Ga-EDTA at 37{degrees}. Gallium-67-citrate was predominantly excreted in the feces (97.2% {+-} 0.2%) after three days, with negligible urine excretion (0.1% {+-} 0.0%) and carcass retention (0.6% {+-} 0.2%). These results are analogous to those obtained for {sup 111}In-DTPA for fecal excretion (96.7% {+-} 2.6%), urine excretion (0.6% {+-} 0.0%) and retention in the carcass (0.2% {+-} 0.0%). Gallium-67-EDTA showed similar partitioning in the liquid phase of the gastric emptying model compared with {sup 113m}In-DTPA. Gallium-67-citrate is an economical and readily available alternative to {sup 111}In-DTPA as a colonic transit radiopharmaceutical. Gallium-67-EDTA is also an alternative to {sup 113m}In-DTPA for assessing liquid-phase emptying in a dual-isotope solid/liquid gastric emptying study. 17 refs., 3 figs., 2 tabs.

  4. (Polyfluoroaryl)fluoroanions of aluminum, gallium, and indium of enhanced utility, uses thereof, and products based thereon

    DOE Patents [OSTI]

    Marks, Tobin J. (Evanston, IL); Chen, You-Xian (Midland, MI)

    2001-01-01T23:59:59.000Z

    The (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium are novel weakly coordinating anions which are are highly fluorinated. (Polyfluoroaryl)fluoroanions of one such type contain at least one ring substituent other than fluorine. These (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium have greater solubility in organic solvents, or have a coordinative ability essentially equal to or less than that of the corresponding (polyfluoroaryl)fluoroanion of aluminum, gallium, or indium in which the substituent is replaced by fluorine. Another type of new (polyfluoroaryl)fluoroanion of aluminum, gallium, and indium have 1-3 perfluorinated fused ring groups and 2-0 perfluorophenyl groups. When used as a cocatalyst in the formation of novel catalytic complexes with d- or f-block metal compounds having at least one leaving group such as a methyl group, these anions, because of their weak coordination to the metal center, do not interefere in the ethylene polymerization process, while affecting the the propylene process favorably, if highly isotactic polypropylene is desired. Thus, the (polyfluoroaryl)fluoroanions of aluminum, gallium, and indium of this invention are useful in various polymerization processes such as are described.

  5. Evolution of ion-induced nanoparticle arrays on GaAs surfaces

    SciTech Connect (OSTI)

    Kang, M.; Al-Heji, A. A.; Shende, O.; Huang, S.; Jeon, S.; Goldman, R. S., E-mail: rsgold@umich.edu [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Beskin, I. [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-1040 (United States)

    2014-05-05T23:59:59.000Z

    We have examined the evolution of irradiation-induced Ga nanoparticle (NP) arrays on GaAs surfaces. Focused-ion-beam irradiation of pre-patterned GaAs surfaces induces monotonic increases in the NP volume and aspect ratio up to a saturation ion dose, independent of NP location within the array. Beyond the saturation ion dose, the NP volume continues to increase monotonically while the NP aspect ratio decreases monotonically. In addition, the NP volumes (aspect ratios) are highest (lowest) for the corner NPs. We discuss the relative influences of bulk and surface diffusion on the evolution of Ga NP arrays.

  6. Second harmonic generation in photonic crystal cavities in (111)-oriented GaAs

    SciTech Connect (OSTI)

    Buckley, Sonia, E-mail: bucklesm@stanford.edu; Radulaski, Marina; Vu?kovi?, Jelena [E. L. Ginzton Laboratory, Stanford University, Stanford, California 94305 (United States)] [E. L. Ginzton Laboratory, Stanford University, Stanford, California 94305 (United States); Biermann, Klaus [Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin (Germany)] [Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin (Germany)

    2013-11-18T23:59:59.000Z

    We demonstrate second harmonic generation at telecommunications wavelengths in photonic crystal cavities in (111)-oriented GaAs. We fabricate 30 photonic crystal structures in both (111)- and (100)-oriented GaAs and observe an increase in generated second harmonic power in the (111) orientation, with the mean power increased by a factor of 3, although there is a large scatter in the measured values. We discuss possible reasons for this increase, in particular, the reduced two photon absorption for transverse electric modes in (111) orientation, as well as a potential increase due to improved mode overlap.

  7. Biexciton emission from single isoelectronic traps formed by nitrogen-nitrogen pairs in GaAs

    SciTech Connect (OSTI)

    Takamiya, Kengo; Fukushima, Toshiyuki; Yagi, Shuhei; Hijikata, Yasuto; Yaguchi, Hiroyuki [Graduate School of Science and Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku , Saitama 338-8570 (Japan); Mochizuki, Toshimitsu; Yoshita, Masahiro; Akiyama, Hidefumi [Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581 (Japan); Kuboya, Shigeyuki; Onabe, Kentaro [Department of Advanced Materials Science, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581 (Japan); Katayama, Ryuji [Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577 (Japan)

    2013-12-04T23:59:59.000Z

    We have studied photoluminescence (PL) from individual isoelectronic traps formed by nitrogen-nitrogen (NN) pairs in GaAs. Sharp emission lines due to exciton and biexciton were observed from individual isoelectronic traps in nitrogen atomic-layer doped (ALD) GaAs. The binding energy of biexciton bound to individual isoelectronic traps was approximately 8 meV. Both the exciton and biexciton luminescence lines show completely random polarization and no fine-structure splitting. These results are desirable to the application to the quantum cryptography used in the field of quantum information technology.

  8. Non-Destructive Spent Fuel Characterization with Semi-Conducting Gallium Arsinde Neutron Imaging Arrays

    SciTech Connect (OSTI)

    Douglas S. McGregor; Holly K. Gersch; Jeffrey D. Sanders; John C. Lee; Mark D. Hammig; Michael R. Hartman; Yong Hong Yang; Raymond T. Klann; Brian Van Der Elzen; John T. Lindsay; Philip A. Simpson

    2002-01-30T23:59:59.000Z

    High resistivity bulk grown GaAs has been used to produce thermal neutron imaging devices for use in neutron radiography and characterizing burnup in spent fuel. The basic scheme utilizes a portable Sb/Be source for monoenergetic (24 keV) neutron radiation source coupled to an Fe filter with a radiation hard B-coated pixellated GaAs detector array as the primary neutron detector. The coated neutron detectors have been tested for efficiency and radiation hardness in order to determine their fitness for the harsh environments imposed by spent fuel. Theoretical and experimental results are presented, showing detector radiation hardness, expected detection efficiency and the spatial resolution from such a scheme. A variety of advanced neutron detector designs have been explored, with experimental results achieving 13% thermal neutron detection efficiency while projecting the possibility of over 30% thermal neutron detection efficiency.

  9. GaAs photovoltaics and optoelectronics using releasable multilayer epitaxial assemblies

    E-Print Network [OSTI]

    Rogers, John A.

    LETTERS GaAs photovoltaics and optoelectronics using releasable multilayer epitaxial assemblies and high electron mobilities. Examples range from effi- cient photovoltaic devices1,2 to radio and logic gates on plates of glass, near-infrared imaging devices on wafers of silicon, and photovoltaic

  10. Dynamics of Subsurface and Surface Chemisorption for B, C, and N on Gaas and Inp

    E-Print Network [OSTI]

    MENON, M.; Allen, Roland E.

    1991-01-01T23:59:59.000Z

    on GaAs. H=HO+ V, @11 0 0 0 (2.7) (2.8) The Green's function for this system is G =(el ?H ) (2.9) Let H be the 1V XX Hamiltonian matrix for a large sys- tem (N~ ~ here). We suppose that H differs from an unperturbed Hamiltonian Ho only in some...

  11. SSL/TLS Session-Aware User Authentication Using a GAA Bootstrapped Key

    E-Print Network [OSTI]

    Sheldon, Nathan D.

    SSL/TLS Session-Aware User Authentication Using a GAA Bootstrapped Key Chunhua Chen1 , Chris J.mitchell@rhul.ac.uk Abstract. Most SSL/TLS-based electronic commerce (e-commerce) ap- plications (including Internet banking a server effectively, and because user authentication methods are typi- cally decoupled from SSL

  12. Measurement of Electron Beam Polarization from Unstrained Bulk GaAs via Two Photon Photoemission

    E-Print Network [OSTI]

    Gay, Timothy J.

    the Continuous Electron Beam Accelerator Facility (CEBAF) at Jefferson Lab, where the polarized electron beamMeasurement of Electron Beam Polarization from Unstrained Bulk GaAs via Two Photon Photoemission Collections Journals About Contact us My IOPscience #12;Measurement of Electron Beam Polarization from

  13. ORIGINAL ARTICLE Highly efficient GaAs solar cells by limiting light emission

    E-Print Network [OSTI]

    Atwater, Harry

    ORIGINAL ARTICLE Highly efficient GaAs solar cells by limiting light emission angle Emily D Kosten1. This isotropic emission corresponds to a significant entropy increase in the solar cell, with a corresponding drop in efficiency. Here, using a detailed balance model, we show that limiting the emission angle

  14. Experimental demonstration of enhanced photon recycling in angle-restricted GaAs solar cells

    E-Print Network [OSTI]

    Faraon, Andrei

    Experimental demonstration of enhanced photon recycling in angle-restricted GaAs solar cells Emily, emphasizing the optical nature of the effect. 1 Introduction For ideal solar cells where all recombination. Despite this theoretical prediction, until recently even the highest efficiency solar cells were not close

  15. Surface science analysis of GaAs photocathodes following sustained electron beam delivery

    SciTech Connect (OSTI)

    Carlos Hernandez-Garcia, Fay Hannon, Marcy Stutzman, V. Shutthanandan, Z. Zhu, M. Nandasri, S. V. Kuchibhatla, S. Thevuthasan, W. P. Hess

    2012-06-01T23:59:59.000Z

    Degradation of the photocathode materials employed in photoinjectors represents a challenge for sustained operation of nuclear physics accelerators and high power Free Electron Lasers (FEL). Photocathode quantum efficiency (QE) degradation is due to residual gasses in the electron source vacuum system being ionized and accelerated back to the photocathode. These investigations are a first attempt to characterize the nature of the photocathode degradation, and employ multiple surface and bulk analysis techniques to investigate damage mechanisms including sputtering of the Cs-oxidant surface monolayer, other surface chemistry effects, and ion implantation. Surface and bulk analysis studies were conducted on two GaAs photocathodes, which were removed from the JLab FEL DC photoemission gun after delivering electron beam, and two control samples. The analysis techniques include Helium Ion Microscopy (HIM), Rutherford Backscattering Spectrometry (RBS), Atomic Force Microscopy (AFM) and Secondary Ion Mass Spectrometry (SIMS). In addition, two high-polarization strained superlattice GaAs photocathode samples, one removed from the Continuous Electron Beam Accelerator Facility (CEBAF) photoinjector and one unused, were also analyzed using Transmission Electron Microscopy (TEM) and SIMS. It was found that heat cleaning the FEL GaAs wafer introduces surface roughness, which seems to be reduced by prolonged use. The bulk GaAs samples retained a fairly well organized crystalline structure after delivering beam but shows evidence of Cs depletion on the surface. Within the precision of the SIMS and RBS measurements the data showed no indication of hydrogen implantation or lattice damage from ion back bombardment in the bulk GaAs wafers. In contrast, SIMS and TEM measurements of the strained superlattice photocathode show clear crystal damage in the wafer from ion back bombardment.

  16. Anionic Gallium-Based Metal;#8722;Organic Framework and Its Sorption and Ion-Exchange Properties

    SciTech Connect (OSTI)

    Banerjee, Debasis; Kim, Sun Jin; Wu, Haohan; Xu, Wenqian; Borkowski, Lauren A.; Li, Jing; Parise, John B. (Kwangju); (Rutgers); (SBU)

    2012-04-30T23:59:59.000Z

    A gallium-based metal-organic framework Ga{sub 6}(C{sub 9}H{sub 3}O{sub 6}){sub 8} {center_dot} (C{sub 2}H{sub 8}N){sub 6}(C{sub 3}H{sub 7}NO){sub 3}(H{sub 2}O){sub 26} [1, Ga{sub 6}(1,3,5-BTC){sub 8} {center_dot} 6DMA {center_dot} 3DMF {center_dot} 26H{sub 2}O], GaMOF-1; BTC = benzenetricarboxylate/trimesic acid and DMA = dimethylamine, with space group I{bar 4}3d, a = 19.611(1) {angstrom}, and V = 7953.4(6) {angstrom}{sup 3}, was synthesized using solvothermal techniques and characterized by synchrotron-based X-ray microcrystal diffraction. Compound 1 contains isolated gallium tetrahedra connected by the organic linker (BTC) forming a 3,4-connected anionic porous network. Disordered positively charged ions and solvent molecules are present in the pore, compensating for the negative charge of the framework. These positively charged molecules could be exchanged with alkali-metal ions, as is evident by an ICP-MS study. The H{sub 2} storage capacity of the parent framework is moderate with a H{sub 2} storage capacity of {approx}0.5 wt % at 77 K and 1 atm.

  17. An assessment of the validity of cerium oxide as a surrogate for plutonium oxide gallium removal studies

    SciTech Connect (OSTI)

    Kolman, D.G.; Park, Y.; Stan, M.; Hanrahan, R.J. Jr.; Butt, D.P.

    1999-03-01T23:59:59.000Z

    Methods for purifying plutonium metal have long been established. These methods use acid solutions to dissolve and concentrate the metal. However, these methods can produce significant mixed waste, that is, waste containing both radioactive and chemical hazards. The volume of waste produced from the aqueous purification of thousands of weapons would be expensive to treat and dispose. Therefore, a dry method of purification is highly desirable. Recently, a dry gallium removal research program commenced. Based on initial calculations, it appeared that a particular form of gallium (gallium suboxide, Ga{sub 2}O) could be evaporated from plutonium oxide in the presence of a reducing agent, such as small amounts of hydrogen dry gas within an inert environment. Initial tests using ceria-based material (as a surrogate for PuO{sub 2}) showed that thermally-induced gallium removal (TIGR) from small samples (on the order of one gram) was indeed viable. Because of the expense and difficulty of optimizing TIGR from plutonium dioxide, TIGR optimization tests using ceria have continued. This document details the relationship between the ceria surrogate tests and those conducted using plutonia.

  18. Tripodal aminophenolate ligand complexes of aluminum(III), gallium(III), and indium(III) in water

    SciTech Connect (OSTI)

    Caravan, P.; Orvig, C. [Univ. of British Columbia, Vancouver (Canada)] [Univ. of British Columbia, Vancouver (Canada)

    1997-01-15T23:59:59.000Z

    This article focuses on the development of radiopharmaceuticals using new chelators of gallium and indium. The radionuclide kinetics and demetalation kinetics are of great consideration. This work explored the effects of ligand backbone variations on the selectivity of multidentate aminophenolate ligands among the trivalent metal ions Al(III), Ga(III) and In(III) in water. 54 refs., 16 figs., 3 tabs.

  19. Simulation assisted design of a gallium phosphide np photovoltaic junction Charles R. Allen, Jong-Hyeok Jeon , Jerry M. Woodall

    E-Print Network [OSTI]

    Woodall, Jerry M.

    University, 1205 W State Street, West Lafayette, IN, USA a r t i c l e i n f o Article history: Received 27 February 2010 Keywords: Gallium phosphide Solar cell Multi-junction CPV Simulation a b s t r a c with measurements of the dark and light response. The light current was measured under an illumination of air mass

  20. Scanning Tunneling Microscopy and Surface Simulation of Zinc-Blende GaN(001) Intrinsic 4 Reconstruction: Linear Gallium Tetramers?

    E-Print Network [OSTI]

    Reconstruction: Linear Gallium Tetramers? Hamad A. AL-Brithen, Rong Yang, Muhammad B. Haider, Costel Constantin and occupied states, in agreement with surface simulations based on the 4 1 linear tetramer model the existence of linear Ga tetramers. DOI: PACS numbers: 68.35.Bs, 68.37.Ef, 73.20.At Based on both fundamental

  1. Femtosecond-scale response of GaAs to ultrafast laser pulses RID A-7793-2008

    E-Print Network [OSTI]

    Dumitrica, T.; Allen, Roland E.

    2002-01-01T23:59:59.000Z

    We present nonadiabatic simulations of the coherent response of crystalline GaAs irradiated by intense femtosecond-scale laser pulses. Above a threshold fluence, which corresponds to promotion of about 12% of the valence electrons...

  2. Nanometer-scale GaAs clusters from organometallic precursors Peter C. Sercel, Winston A. Saunders, Harry A. Atwater,

    E-Print Network [OSTI]

    Atwater, Harry

    the first direct observation of gas-phase ho- mogeneous nucleation of GaAs by the thermophoretic col thermophoret- ically on a holey carbon film which is mounted on a stain- less steel fixture aligned coaxially

  3. Comparison of strong coupling regimes in bulk GaAs, GaN and ZnO semiconductor microcavities

    E-Print Network [OSTI]

    Boyer, Edmond

    , transmission and absorption spectra of bulk GaAs, GaN and ZnO microcavities, in order to compareComparison of strong coupling regimes in bulk GaAs, GaN and ZnO semiconductor microcavities SAs and GaN microcavities. PACS numbers: 78.67.-n, 71.36.+c, 78.20.Ci, 78.55.Cr, 78.55.Et Keywords: polariton

  4. Anomalous diffusion of Ga and As from semi-insulating GaAs substrate into MOCVD grown ZnO films as a function of annealing temperature and its effect on charge compensation

    SciTech Connect (OSTI)

    Biswas, Pranab; Banerji, P., E-mail: pallab@matsc.iitkgp.ernet.in [Materials Science Centre, Indian Institute of Technology, Kharagpur 721 302 (India); Halder, Nripendra N. [Advanced Technology Development Centre, Indian Institute of Technology, Kharagpur 721 302 (India)] [Advanced Technology Development Centre, Indian Institute of Technology, Kharagpur 721 302 (India); Kundu, Souvik [School of Electrical Engineering and Computer Science, Oregon State University, 1148 Kelley Engineering Center, Corvallis, OR 97331–5501 (United States)] [School of Electrical Engineering and Computer Science, Oregon State University, 1148 Kelley Engineering Center, Corvallis, OR 97331–5501 (United States); Shripathi, T.; Gupta, M. [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452 001 (India)] [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452 001 (India)

    2014-05-15T23:59:59.000Z

    The diffusion behavior of arsenic (As) and gallium (Ga) atoms from semi-insulating GaAs (SI-GaAs) into ZnO films upon post-growth annealing vis-à-vis the resulting charge compensation was investigated with the help of x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy. The films, annealed at 600 ºC and 700 ºC showed p-type conductivity with a hole concentration of 1.1 × 10{sup 18} cm{sup ?3} and 2.8 × 10{sup 19} cm{sup ?3} respectively, whereas those annealed at 800 ºC showed n-type conductivity with a carrier concentration of 6.5 × 10{sup 16} cm{sup ?3}. It is observed that at lower temperatures, large fraction of As atoms diffused from the SI-GaAs substrates into ZnO and formed acceptor related complex, (As{sub Zn}–2V{sub Zn}), by substituting Zn atoms (As{sub Zn}) and thereby creating two zinc vacancies (V{sub Zn}). Thus as-grown ZnO which was supposed to be n-type due to nonstoichiometric nature showed p-type behavior. On further increasing the annealing temperature to 800 ºC, Ga atoms diffused more than As atoms and substitute Zn atoms thereby forming shallow donor complex, Ga{sub Zn}. Electrons from donor levels then compensate the p-type carriers and the material reverts back to n-type. Thus the conversion of carrier type took place due to charge compensation between the donors and acceptors in ZnO and this compensation is the possible origin of anomalous conduction in wide band gap materials.

  5. X-ray induced optical reflectivity

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Durbin, Stephen M.

    2012-01-01T23:59:59.000Z

    The change in optical reflectivity induced by intense x-ray pulses can now be used to study ultrafast many body responses in solids in the femtosecond time domain. X-ray absorption creates photoelectrons and core level holes subsequently filled by Auger or fluorescence processes, and these excitations ultimately add conduction and valence band carriers that perturb optical reflectivity.Optical absorption associated with band filling and band gap narrowing is shown to explain the basic features found in recent measurements on an insulator (silicon nitride, Si3N4), a semiconductor(gallium arsenide,GaAs), and a metal (gold,Au), obtained with ?100 fs x-ray pulses at 500-2000 eV and probed with 800 nm laser pulses. In particular GaAs exhibits an abrupt drop in reflectivity, persisting only for a time comparable to the x-ray excitation pulse duration, consistent with prompt band gap narrowing.

  6. Ion Trap in a Semiconductor Chip

    E-Print Network [OSTI]

    D. Stick; W. K. Hensinger; S. Olmschenk; M. J. Madsen; K. Schwab; C. Monroe

    2006-01-09T23:59:59.000Z

    The electromagnetic manipulation of isolated atoms has led to many advances in physics, from laser cooling and Bose-Einstein condensation of cold gases to the precise quantum control of individual atomic ion. Work on miniaturizing electromagnetic traps to the micrometer scale promises even higher levels of control and reliability. Compared with 'chip traps' for confining neutral atoms, ion traps with similar dimensions and power dissipation offer much higher confinement forces and allow unparalleled control at the single-atom level. Moreover, ion microtraps are of great interest in the development of miniature mass spectrometer arrays, compact atomic clocks, and most notably, large scale quantum information processors. Here we report the operation of a micrometer-scale ion trap, fabricated on a monolithic chip using semiconductor micro-electromechanical systems (MEMS) technology. We confine, laser cool, and measure heating of a single 111Cd+ ion in an integrated radiofrequency trap etched from a doped gallium arsenide (GaAs) heterostructure.

  7. Micro-cooler enhancements by barrier interface analysis

    SciTech Connect (OSTI)

    Stephen, A.; Dunn, G. M. [Department of Physics, University of Aberdeen, King's College, AB24 3UE Aberdeen (United Kingdom)] [Department of Physics, University of Aberdeen, King's College, AB24 3UE Aberdeen (United Kingdom); Glover, J.; Oxley, C. H. [Department of Engineering, De Montfort University, Gateway, LE1 9BH Leicester (United Kingdom)] [Department of Engineering, De Montfort University, Gateway, LE1 9BH Leicester (United Kingdom); Bajo, M. Montes; Kuball, M. [Center for Device Thermography and Reliability, H. H. Wills Physics Laboratory, University of Bristol, BS8 1TL Bristol (United Kingdom)] [Center for Device Thermography and Reliability, H. H. Wills Physics Laboratory, University of Bristol, BS8 1TL Bristol (United Kingdom); Cumming, D. R. S.; Khalid, A. [School of Engineering, University of Glasgow, Rankine Building, G12 8LT Glasgow (United Kingdom)] [School of Engineering, University of Glasgow, Rankine Building, G12 8LT Glasgow (United Kingdom)

    2014-02-15T23:59:59.000Z

    A novel gallium arsenide (GaAs) based micro-cooler design, previously analysed both experimentally and by an analytical Heat Transfer (HT) model, has been simulated using a self-consistent Ensemble Monte Carlo (EMC) model for a more in depth analysis of the thermionic cooling in the device. The best fit to the experimental data was found and was used in conjunction with the HT model to estimate the cooler-contact resistance. The cooling results from EMC indicated that the cooling power of the device is highly dependent on the charge distribution across the leading interface. Alteration of this charge distribution via interface extensions on the nanometre scale has shown to produce significant changes in cooler performance.

  8. Epitaxial two-dimensional nitrogen atomic sheet in GaAs

    SciTech Connect (OSTI)

    Harada, Yukihiro, E-mail: y.harada@eedept.kobe-u.ac.jp; Yamamoto, Masuki; Baba, Takeshi; Kita, Takashi [Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe 657-8501 (Japan)

    2014-01-27T23:59:59.000Z

    We have grown an epitaxial two-dimensional nitrogen (N) atomic sheet in GaAs by using the site-controlled N ?-doping technique. We observed a change of the electronic states in N ?-doped GaAs from the isolated impurity centers to the delocalized impurity band at 1.49?eV with increasing N-doping density. According to the excitation-power- and temperature-dependent photoluminescence (PL) spectra, the emission related to localized levels below the impurity band edge was dominant at low excitation power and temperature, whereas the effects of the localized levels can be neglected by increasing the excitation power and temperature. Furthermore, a clear Landau shift of the PL-peak energy was observed at several Tesla in the Faraday configuration, in contrast to the case in the impurity limit.

  9. Cavity nucleation and evolution in He-implanted Si and GaAs

    SciTech Connect (OSTI)

    Follstaedt, D.M.; Myers, S.M.; Petersen, G.A.; Barbour, J.C.

    1995-12-01T23:59:59.000Z

    The criteria for forming stable cavities by He{sup +} implantation and annealing are examined for Si and GaAs. In Si, implanting at room temperature requires a minimum of 1.6 at. % He to form a continuous layer of cavities after annealing at 700{degrees}C. The cavities are located at dislocations and planar defects. Implanting peak He concentrations just above this threshold produces narrow layers of cavities at the projected range. In GaAs, room-temperature implantation followed by annealing results in exfoliation of the surface layer. Cavities were formed instead by implanting Ar followed by overlapping He, both at 400{degrees}C, with additional annealing at 400{degrees}C to outgas the He. This method forms 1.5--3.5 nm cavities that are often on [111] planar defects.

  10. Effects of atomic hydrogen and deuterium exposure on high polarization GaAs photocathodes

    SciTech Connect (OSTI)

    M. Baylac; P. Adderley; J. Brittian; J. Clark; T. Day; J. Grames; J. Hansknecht; M. Poelker; M. Stutzman; A. T. Wu; A. S. Terekhov

    2005-12-01T23:59:59.000Z

    Strained-layer GaAs and strained-superlattice GaAs photocathodes are used at Jefferson Laboratory to create high average current beams of highly spin-polarized electrons. High electron yield, or quantum efficiency (QE), is obtained only when the photocathode surface is atomically clean. For years, exposure to atomic hydrogen or deuterium has been the photocathode cleaning technique employed at Jefferson Laboratory. This work demonstrates that atomic hydrogen cleaning is not necessary when precautions are taken to ensure that clean photocathode material from the vendor is not inadvertently dirtied while samples are prepared for installation inside photoemission guns. Moreover, this work demonstrates that QE and beam polarization can be significantly reduced when clean high-polarization photocathode material is exposed to atomic hydrogen from an rf dissociator-style atomic hydrogen source. Surface analysis provides some insight into the mechanisms that degrade QE and polarization due to atomic hydrogen cleaning.

  11. Identification of As-vacancy complexes in Zn-diffused GaAs

    SciTech Connect (OSTI)

    Elsayed, M. [Department of Physics, Martin Luther University Halle, 06099 Halle (Germany); Department of Physics, Faculty of Science, Minia University, 61519 Minia (Egypt); Krause-Rehberg, R. [Department of Physics, Martin Luther University Halle, 06099 Halle (Germany); Korff, B. [Bremen Center for Computational Materials Science, University Bremen, 28359 Bremen (Germany); Richter, S. [Fraunhofer Center for Silicon Photovoltaics CSP, 06120 Halle (Saale) (Germany); Leipner, H. S. [Center of Materials Science, Martin Luther University Halle, 06099 Halle (Germany)

    2013-03-07T23:59:59.000Z

    We have used positron annihilation spectroscopy to study the introduction of point defects in Zn-diffused semi-insulating GaAs. The diffusion was performed by annealing the samples for 2 h at 950 Degree-Sign C. The samples were etched in steps of 7 {mu}m. Both Doppler broadening using slow positron beam and lifetime spectroscopy studies were performed after each etching step. Both techniques showed the existence of vacancy-type defects in a layer of about 45 {mu}m. Secondary ion mass spectroscopy measurements illustrated the presence of Zn at high level in the sample almost up to the same depth. Vacancy-like defects as well as shallow positron traps were observed by lifetime measurements. We distinguish two kinds of defects: As vacancy belongs to defect complex, bound to most likely one Zn atom incorporated on Ga sublattice, and negative-ion-type positron traps. Zn acceptors explained the observation of shallow traps. The effect of Zn was evidenced by probing GaAs samples annealed under similar conditions but without Zn treatment. A defect-free bulk lifetime value is detected in this sample. Moreover, our positron annihilation spectroscopy measurements demonstrate that Zn diffusion in GaAs system is governed by kick-out mechanism.

  12. In situ analyses on negative ions in the indium-gallium-zinc oxide sputtering process

    SciTech Connect (OSTI)

    Jia, Junjun; Torigoshi, Yoshifumi; Shigesato, Yuzo [Graduate School of Science and Engineering, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo, Sagamihara, Kanagawa 252-5258 (Japan)

    2013-07-01T23:59:59.000Z

    The origin of negative ions in the dc magnetron sputtering process using a ceramic indium-gallium-zinc oxide target has been investigated by in situ analyses. The observed negative ions are mainly O{sup -} with energies corresponding to the target voltage, which originates from the target and barely from the reactive gas (O{sub 2}). Dissociation of ZnO{sup -}, GaO{sup -}, ZnO{sub 2}{sup -}, and GaO{sub 2}{sup -} radicals also contributes to the total negative ion flux. Furthermore, we find that some sputtering parameters, such as the type of sputtering gas (Ar or Kr), sputtering power, total gas pressure, and magnetic field strength at the target surface, can be used to control the energy distribution of the O{sup -} ion flux.

  13. Origin of deep subgap states in amorphous indium gallium zinc oxide: Chemically disordered coordination of oxygen

    SciTech Connect (OSTI)

    Sallis, S.; Williams, D. S. [Materials Science and Engineering, Binghamton University, Binghamton, New York 13902 (United States); Butler, K. T.; Walsh, A. [Center for Sustainable Technologies and Department of Chemistry, University of Bath, Claverton Down, Bath BA2 7AY (United Kingdom); Quackenbush, N. F. [Department of Physics, Applied Physics, and Astronomy, Binghamton University, Binghamton, New York 13902 (United States); Junda, M.; Podraza, N. J. [Department of Physics and Astronomy, University of Toledo, Toledo, Ohio 43606 (United States); Fischer, D. A.; Woicik, J. C. [Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); White, B. E.; Piper, L. F. J., E-mail: lpiper@binghamton.edu [Department of Physics, Applied Physics, and Astronomy, Binghamton University, Binghamton, New York 13902 (United States); Materials Science and Engineering, Binghamton University, Binghamton, New York 13902 (United States)

    2014-06-09T23:59:59.000Z

    The origin of the deep subgap states in amorphous indium gallium zinc oxide (a-IGZO), whether intrinsic to the amorphous structure or not, has serious implications for the development of p-type transparent amorphous oxide semiconductors. We report that the deep subgap feature in a-IGZO originates from local variations in the oxygen coordination and not from oxygen vacancies. This is shown by the positive correlation between oxygen composition and subgap intensity as observed with X-ray photoelectron spectroscopy. We also demonstrate that the subgap feature is not intrinsic to the amorphous phase because the deep subgap feature can be removed by low-temperature annealing in a reducing environment. Atomistic calculations of a-IGZO reveal that the subgap state originates from certain oxygen environments associated with the disorder. Specifically, the subgap states originate from oxygen environments with a lower coordination number and/or a larger metal-oxygen separation.

  14. The structure of GaAs/Si(211) heteroepitaxial layers

    SciTech Connect (OSTI)

    Liliental-Weber, Z.; Weber, E.R.; Washburn, J.; Liu, T.Y.; Kroemer, H.

    1985-05-01T23:59:59.000Z

    Gallium arsenide films grown on (211)Si by molecular-beam epitaxy have been investigated using transmission electron microscopy. The main defects observed in the alloy were of misfit dislocations, stacking faults, and microtwin lamellas. Silicon surface preparation was found to play an important role on the density of defects formed at the Si/GaAs interface. Two different types of strained-layer superlattices, InGaAs/InGaP and InGaAs/GaAs, were applied either directly to the Si substrate, to a graded layer (GaP-InGaP), or to a GaAs buffer layer to stop the defect propagation into the GaAs films. Applying InGaAs/GaAs instead of InGaAs/InGaP was found to be more effective in blocking defect propagation. In all cases of strained-layer superlattices investigated, dislocation propagation was stopped primarily at the top interface between the superlattice package and GaAs. Graded layers and unstrained AlGaAs/GaAs superlattices did not significantly block dislocations propagating from the interface with Si. Growing of a 50 nm GaAs buffer layer at 505/sup 0/C followed by 10 strained-layer superlattices of InGaAs/GaAs (5 nm each) resulted in the lowest dislocation density in the GaAs layer (approx.5 x 10/sup 7//cm/sup 2/) among the structures investigated. This value is comparable to the recently reported density of dislocations in the GaAs layers grown on (100)Si substrates. Applying three sets of the same strained layers decreased the density of dislocations an additional approx.2 to 3 times.

  15. Preparation of copper-indium-gallium-diselenide precursor films by electrodeposition for fabricating high efficiency solar cells

    DOE Patents [OSTI]

    Bhattacharya, Raghu N. (Littleton, CO); Hasoon, Falah S. (Arvada, CO); Wiesner, Holm (Golden, CO); Keane, James (Lakewood, CO); Noufi, Rommel (Golden, CO); Ramanathan, Kannan (Golden, CO)

    1999-02-16T23:59:59.000Z

    A photovoltaic cell exhibiting an overall conversion efficiency of 13.6% is prepared from a copper-indium-gallium-diselenide precursor thin film. The film is fabricated by first simultaneously electrodepositing copper, indium, gallium, and selenium onto a glass/molybdenum substrate (12/14). The electrodeposition voltage is a high frequency AC voltage superimposed upon a DC voltage to improve the morphology and growth rate of the film. The electrodeposition is followed by physical vapor deposition to adjust the final stoichiometry of the thin film to approximately Cu(In.sub.1-n Ga.sub.x)Se.sub.2, with the ratio of Ga/(In+Ga) being approximately 0.39.

  16. Test vehicle detector characterization system for the Boeing YAL-1 airborne laser

    E-Print Network [OSTI]

    Steininger-Holmes, Jason Thomas

    2008-01-01T23:59:59.000Z

    The test vehicle detector characterization system provides a convenient and efficient tool for rapidly evaluating the optical sensitivity of the GAP6012, GAP100, GAP300, and GAP1000 indium gallium arsenide detectors used ...

  17. High mobility single-crystalline-like GaAs thin films on inexpensive flexible metal substrates by metal-organic chemical vapor deposition

    SciTech Connect (OSTI)

    Dutta, P., E-mail: pdutta2@central.uh.edu; Rathi, M.; Gao, Y.; Yao, Y.; Selvamanickam, V. [Department of Mechanical Engineering, University of Houston, Houston, Texas 77204 (United States); Zheng, N.; Ahrenkiel, P. [Department of Nanoscience and Nanoengineering, South Dakota School of Mines and Technology, Rapid City, South Dakota 57701 (United States); Martinez, J. [Materials Evaluation Laboratory, NASA Johnson Space Center, Houston, Texas 77085 (United States)

    2014-09-01T23:59:59.000Z

    We demonstrate heteroepitaxial growth of single-crystalline-like n and p-type doped GaAs thin films on inexpensive, flexible, and light-weight metal foils by metal-organic chemical vapor deposition. Single-crystalline-like Ge thin film on biaxially textured templates made by ion beam assisted deposition on metal foil served as the epitaxy enabling substrate for GaAs growth. The GaAs films exhibited strong (004) preferred orientation, sharp in-plane texture, low grain misorientation, strong photoluminescence, and a defect density of ?10{sup 7?}cm{sup ?2}. Furthermore, the GaAs films exhibited hole and electron mobilities as high as 66 and 300?cm{sup 2}/V-s, respectively. High mobility single-crystalline-like GaAs thin films on inexpensive metal substrates can pave the path for roll-to-roll manufacturing of flexible III-V solar cells for the mainstream photovoltaics market.

  18. Engineering direct-indirect band gap transition in wurtzite GaAs nanowires through size and uniaxial strain

    E-Print Network [OSTI]

    Copple, Andrew; Peng, Xihong; 10.1063/1.4718026

    2012-01-01T23:59:59.000Z

    Electronic structures of wurtzite GaAs nanowires in the [0001] direction were studied using first-principles calculations. It was found that the band gap of GaAs nanowires experience a direct-to-indirect transition when the diameter of the nanowires is smaller than ~28 {\\AA}. For those thin GaAs nanowires with an indirect band gap, it was found that the gap can be tuned to be direct if a moderate external uniaxial strain is applied. Both tensile and compressive strain can trigger the indirect-to-direct gap transition. The critical strains for the gap-transition are determined by the energy crossover of two states in conduction bands.

  19. Back-contacted and small form factor GaAs solar cell.

    SciTech Connect (OSTI)

    Clews, Peggy Jane; Wanlass, Mark W. (National Renewable Energy Laboratory, Golden, CO); Sanchez, Carlos A.; Pluym, Tammy; Cruz-Campa, Jose Luis; Okandan, Murat; Gupta, Vipin P.; Nielson, Gregory N.; Resnick, Paul James

    2010-07-01T23:59:59.000Z

    We present a newly developed microsystem enabled, back-contacted, shade-free GaAs solar cell. Using microsystem tools, we created sturdy 3 {micro}m thick devices with lateral dimensions of 250 {micro}m, 500 {micro}m, 1 mm, and 2 mm. The fabrication procedure and the results of characterization tests are discussed. The highest efficiency cell had a lateral size of 500 {micro}m and a conversion efficiency of 10%, open circuit voltage of 0.9 V and a current density of 14.9 mA/cm{sup 2} under one-sun illumination.

  20. Ultrafast magneto-photocurrents in GaAs: Separation of surface and bulk contributions

    E-Print Network [OSTI]

    Schmidt, Christian B; Tarasenko, Sergey A; Bieler, Mark

    2015-01-01T23:59:59.000Z

    We induce ultrafast magneto-photocurrents in a GaAs crystal employing interband excitation with femtosecond laser pulses at room temperature and non-invasively separate surface and bulk contributions to the overall current response. The separation between the different symmetry contributions is achieved by measuring the simultaneously emitted terahertz radiation for different sample orientations. Excitation intensity and photon energy dependences of the magneto-photocurrents for linearly and circularly polarized excitations reveal an involvement of different microscopic origins, one of which we believe is the inverse Spin-Hall effect. Our experiments are important for a better understanding of the complex momentum-space carrier dynamics in magnetic fields.

  1. High excitation power photoluminescence studies of ultra-low density GaAs quantum dots

    SciTech Connect (OSTI)

    Sonnenberg, D.; Graf, A.; Paulava, V.; Heyn, Ch.; Hansen, W. [Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Universität Hamburg, Jungiusstr. 11, 20355 Hamburg (Germany)

    2013-12-04T23:59:59.000Z

    We fabricate GaAs epitaxial quantum dots (QDs) by filling of self-organized nanoholes in AlGaAs. The QDs are fabricated under optimized process conditions and have ultra-low density in the 10{sup 6} cm{sup ?2} regime. At low excitation power the optical emission of single QDs exhibit sharp excitonic lines, which are attributed to the recombination of excitonic and biexcitonic states. High excitation power measurements reveal surprisingly broad emission lines from at least six QD shell states.

  2. Origins of ion irradiation-induced Ga nanoparticle motion on GaAs surfaces

    SciTech Connect (OSTI)

    Kang, M.; Wu, J. H.; Chen, H. Y.; Thornton, K.; Goldman, R. S. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States)] [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Sofferman, D. L. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States) [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Department of Physics, Adelphi University, Garden City, New York 11530-0701 (United States); Beskin, I. [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-1040 (United States)] [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-1040 (United States)

    2013-08-12T23:59:59.000Z

    We have examined the origins of ion irradiation-induced nanoparticle (NP) motion. Focused-ion-beam irradiation of GaAs surfaces induces random walks of Ga NPs, which are biased in the direction opposite to that of ion beam scanning. Although the instantaneous NP velocities are constant, the NP drift velocities are dependent on the off-normal irradiation angle, likely due to a difference in surface non-stoichiometry induced by the irradiation angle dependence of the sputtering yield. It is hypothesized that the random walks are initiated by ion irradiation-induced thermal fluctuations, with biasing driven by anisotropic mass transport.

  3. Picosecond buildup and relaxation of intense stimulated emission in GaAs

    SciTech Connect (OSTI)

    Ageeva, N. N.; Bronevoi, I. L., E-mail: bil@cplire.ru; Zabegaev, D. N.; Krivonosov, A. N. [Russian Academy of Sciences, Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)

    2013-04-15T23:59:59.000Z

    In support of the idea developed previously based on circumstantial evidence, we have found that stimulated emission emerges in GaAs and its intensity increases with a picosecond delay relative to the front of powerful picosecond optical pumping that produced a dense electron-hole plasma. The emission intensity relaxes with decreasing pumping with a characteristic time of {approx}10 ps. We have derived the dependences of the delay time, the relaxation time, and the duration of the picosecond emission pulse on its photon energy. The estimates based on the fact that the relaxation of emission is determined by electron-hole plasma cooling correspond to the measured relaxation time.

  4. Droplet destabilization during Bi catalyzed vapor-liquuid-solid growth of GaAs

    SciTech Connect (OSTI)

    DeJarld, M., E-mail: mdejarld@umich.edu; Nothern, D.; Millunchick, J. M. [Department of Materials Science and Engineering, University of Michigan 2300 Hayward Street, Ann Arbor, Michigan 48105 (United States)

    2014-03-21T23:59:59.000Z

    GaAs nanodiscs are grown in a molecular beam epitaxy chamber via the vapor-liquid-solid mechanism with liquid Bi as the catalyst. Each nanostructure consists of a series of increasingly larger overlapping discs. The structure forms during deposition due to the fact that the catalyst grows until reaching a critical size whereupon it destabilizes, dropping off the disc onto the substrate, where it catalyzes the growth of a new disc of larger radius. It is shown that critical size is limited by the sidewall wetting with a contact angle significantly smaller than the Gibb's criterion.

  5. Photo: D. Stevenson and C. Conway/Beckman Institute/University of Illinois An inorganic LED display printed on a flexible substrate bends without breaking

    E-Print Network [OSTI]

    Rogers, John A.

    by the Ford Motor Co., which envisions many possible automotive applications for thin, flexible lighting this atop a layer of aluminum arsenide which itself coated a gallium arsenide substrate. Using a combination, such displays would be almost completely transparent--and well suited for another automotive need: inexpensive

  6. Waveguide effect of GaAsSb quantum wells in a laser structure based on GaAs

    SciTech Connect (OSTI)

    Aleshkin, V. Ya. [Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation)] [Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation); Afonenko, A. A. [Belarussian State University (Belarus)] [Belarussian State University (Belarus); Dikareva, N. V. [Research Physical-Technical Institute of Nizhni Novgorod State University (Russian Federation)] [Research Physical-Technical Institute of Nizhni Novgorod State University (Russian Federation); Dubinov, A. A., E-mail: sanya@ipm.sci-nnov.ru; Kudryavtsev, K. E.; Morozov, S. V. [Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation)] [Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation); Nekorkin, S. M. [Research Physical-Technical Institute of Nizhni Novgorod State University (Russian Federation)] [Research Physical-Technical Institute of Nizhni Novgorod State University (Russian Federation)

    2013-11-15T23:59:59.000Z

    The waveguide effect of GaAsSb quantum wells in a semiconductor-laser structure based on GaAs is studied theoretically and experimentally. It is shown that quantum wells themselves can be used as waveguide layers in the laser structure. As the excitation-power density attains a value of 2 kW/cm{sup 2} at liquid-nitrogen temperature, superluminescence at the wavelength corresponding to the optical transition in bulk GaAs (at 835 nm) is observed.

  7. Deep level defects in proton radiated GaAs grown on metamorphic SiGe/Si substrates

    SciTech Connect (OSTI)

    Gonzalez, M.; Andre, C. L.; Walters, R. J.; Messenger, S. R.; Warner, J. H.; Lorentzen, J. R.; Pitera, A. J.; Fitzgerald, E. A.; Ringel, S. A. [Department of Electrical and Computer Engineering, Ohio State University, Columbus, Ohio 43210 (United States); U.S. Naval Research Laboratory, Code 6818, Washington, DC 20375 (United States); Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States); Department of Electrical and Computer Engineering, Ohio State University, Columbus, Ohio 43210 (United States)

    2006-08-01T23:59:59.000Z

    The effect of 2 MeV proton radiation on the introduction of deep levels in GaAs grown on compositionally graded SiGe/Si substrates was investigated using deep level transient spectroscopy (DLTS). Systematic comparisons were made with identical layers grown on both GaAs and Ge substrates to directly assess the influence of threading dislocations on radiation-related deep levels for both n-type and p-type GaAs. DLTS revealed that for p{sup +}n structures, proton irradiation generates electron traps at E{sub c}-0.14 eV, E{sub c}-0.25 eV, E{sub c}-0.54 eV, and E{sub c}-0.72 eV in the n-GaAs base, and, for n{sup +}p structures, radiation-induced hole traps appear at E{sub v}+0.18 eV, E{sub v}+0.23 eV, E{sub v}+0.27 eV, and E{sub v}+0.77 eV in the p-type GaAs base, irrespective of substrate choice for both polarities. The primary influence of substituting SiGe/Si substrates for conventional GaAs and Ge substrates is on the introduction rates of the individual traps as a function of proton radiation fluence. Substantially reduced concentrations are found for each radiation-induced hole trap observed in p-type GaAs, as well as for the E{sub c}-0.54 eV trap in n-GaAs for samples on SiGe/Si, as a function of proton fluence. Calculated trap introduction rates reveal reductions by as much as {approx}40% for certain hole traps in p-GaAs grown on SiGe/Si. This increased radiation tolerance for GaAs grown on SiGe/Si is attributed to interactions between the low density ({approx}10{sup 6} cm{sup -2}) of residual dislocations within the metamorphic GaAs/SiGe/Si structure and the radiation-induced point defects. Nevertheless, the fact that the impact of dislocations on radiation tolerance is far more dramatic for n{sup +}p GaAs structures compared to p{sup +}n structures, may have implications on future III-V/Si space solar cell design optimization, since end-of-life versus beginning-of-life differences are critical factors for power profiling in high radiation environments.

  8. Electronic passivation of silicon surfaces by thin films of atomic layer deposited gallium oxide

    SciTech Connect (OSTI)

    Allen, T. G., E-mail: thomas.allen@anu.edu.au; Cuevas, A. [Research School of Engineering, Australian National University, Canberra 0200 (Australia)

    2014-07-21T23:59:59.000Z

    This paper proposes the application of gallium oxide (Ga{sub 2}O{sub 3}) thin films to crystalline silicon solar cells. Effective passivation of n- and p-type crystalline silicon surfaces has been achieved by the application of very thin Ga{sub 2}O{sub 3} films prepared by atomic layer deposition using trimethylgallium (TMGa) and ozone (O{sub 3}) as the reactants. Surface recombination velocities as low as 6.1?cm/s have been recorded with films less than 4.5?nm thick. A range of deposition parameters has been explored, with growth rates of approximately 0.2?Å/cycle providing optimum passivation. The thermal activation energy for passivation of the Si-Ga{sub 2}O{sub 3} interface has been found to be approximately 0.5?eV. Depassivation of the interface was observed for prolonged annealing at increased temperatures. The activation energy for depassivation was measured to be 1.9?eV.

  9. Gallium ion implantation greatly reduces thermal conductivity and enhances electronic one of ZnO nanowires

    SciTech Connect (OSTI)

    Xia, Minggang, E-mail: xiamg@mail.xjtu.edu.cn [Laboratory of Nanostructure and its Physics Properties, Department of Optical Information Science and Technology, Department of Applied Physics, and MOE Key Laboratory for Non-equilibrium Synthesis and Modulation of Condensed Matter, School of Science, Xi'an Jiaotong University, 710049 China (China); Department of Physics and Centre for Computational Science and Engineering, National University of Singapore, Singapore 117542 (Singapore); Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore); Cheng, Zhaofang; Han, Jinyun; Zhang, Shengli [Laboratory of Nanostructure and its Physics Properties, Department of Optical Information Science and Technology, Department of Applied Physics, and MOE Key Laboratory for Non-equilibrium Synthesis and Modulation of Condensed Matter, School of Science, Xi'an Jiaotong University, 710049 China (China); Zheng, Minrui [Department of Physics and Centre for Computational Science and Engineering, National University of Singapore, Singapore 117542 (Singapore); Sow, Chorng-Haur [Department of Physics and Centre for Computational Science and Engineering, National University of Singapore, Singapore 117542 (Singapore); National University of Singapore Nanoscience and Nanotechnology Initiative, National University of Singapore, Singapore 117542 (Singapore); Thong, John T. L. [Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore); Li, Baowen [Department of Physics and Centre for Computational Science and Engineering, National University of Singapore, Singapore 117542 (Singapore); National University of Singapore Nanoscience and Nanotechnology Initiative, National University of Singapore, Singapore 117542 (Singapore); Center for Phononics and Thermal Energy Science, School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China)

    2014-05-15T23:59:59.000Z

    The electrical and thermal conductivities are measured for individual zinc oxide (ZnO) nanowires with and without gallium ion (Ga{sup +}) implantation at room temperature. Our results show that Ga{sup +} implantation enhances electrical conductivity by one order of magnitude from 1.01 × 10{sup 3} ?{sup ?1}m{sup ?1} to 1.46 × 10{sup 4} ?{sup ?1}m{sup ?1} and reduces its thermal conductivity by one order of magnitude from 12.7 Wm{sup ?1}K{sup ?1} to 1.22 Wm{sup ?1}K{sup ?1} for ZnO nanowires of 100 nm in diameter. The measured thermal conductivities are in good agreement with those in theoretical simulation. The increase of electrical conductivity origins in electron donor doping by Ga{sup +} implantation and the decrease of thermal conductivity is due to the longitudinal and transverse acoustic phonons scattering by Ga{sup +} point scattering. For pristine ZnO nanowires, the thermal conductivity decreases only two times when its diameter reduces from 100 nm to 46 nm. Therefore, Ga{sup +}-implantation may be a more effective method than diameter reduction in improving thermoelectric performance.

  10. Crystal structure and electron microprobe analyses of a lanthanum lutetium gallium garnet

    SciTech Connect (OSTI)

    Parise, J.B.; Harlow, R.L.; Shannon, R.D. (Central Research and Development Department, E. I. DuPont De Nemours and Co., Experimental Station, Wilmington, Delaware 19880-0228 (United States)); Kwei, G.H. (LANSCE, MS-H805, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)); Allik, T.H. (Science Applications International Corporation, 1710 Goodridge Dr., P.O. Box 1303, McLean, Virginia 22102 (United States)); Armstrong, J.T. (Department of Geological and Planetary Sciences, California Institute of Technology, Pasadena, California 91125 (United States))

    1992-09-15T23:59:59.000Z

    Single-crystal electron microprobe analysis of a lanthanum lutetium gallium garnet has resulted in a composition of La{sub 2.37}Nd{sub 0.07}Pb{sub 0.01}Lu{sub 2.54}Cr{sub 0.01} Ga{sub 3.00}O{sub 12}. This composition gives better agreement between observed and calculated total dielectric polarizabilities than previously reported compositions (La{sub 2.26--2.32}Nd{sub 0.04}Lu{sub 2.57--2.63}Ga{sub 3.07}O{sub 12} by x-ray fluorescence and La{sub 2.655}Nd{sub 0.027}Lu{sub 2.656}Ga{sub 2.655}O{sub 12} by inductively coupled plasma analyses), and does not imply the crystal-chemically improbable presence of Lu{sup 3+} in the tetrahedral site. X-ray and neutron crystal-structure analyses have confirmed that little or no Lu resides in this site.

  11. Optical waveguiding properties into porous gallium nitride structures investigated by prism coupling technique

    SciTech Connect (OSTI)

    Alshehri, Bandar; Dogheche, Elhadj, E-mail: elhadj.dogheche@univ-valenciennes.fr [Institute Electronics, Microelectronics and Nanotechnology (IEMN CNRS), University of Valenciennes, Villeneuve d'Ascq (France); Lee, Seung-Min; Kang, Jin-Ho; Ryu, Sang-Wan, E-mail: sangwan@chonnam.ac.kr [Department of Physics, Chonnam National University, Gwangju 500-757 (Korea, Republic of); Gong, Su-Hyun; Cho, Yong-Hoon [Department of Physics and KI for the NanoCentury, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 305-701 (Korea, Republic of)

    2014-08-04T23:59:59.000Z

    In order to modulate the refractive index and the birefringence of Gallium Nitride (GaN), we have developed a chemical etching method to perform porous structures. The aim of this research is to demonstrate that optical properties of GaN can be tuned by controlling the pores density. GaN films are prepared on sapphire by metal organic chemical vapor deposition and the microstructure is characterized by transmission electron microscopy, and scanning electron microscope analysis. Optical waveguide experiment is demonstrated here to determine the key properties as the ordinary (n{sub 0}) and extraordinary (n{sub e}) refractive indices of etched structures. We report here the dispersion of refractive index for porous GaN and compare it to the bulk material. We observe that the refractive index decreases when the porous density p is increased: results obtained at 0.975??m have shown that the ordinary index n{sub 0} is 2.293 for a bulk layer and n{sub 0} is 2.285 for a pores density of 20%. This value corresponds to GaN layer with a pore size of 30?nm and inter-distance of 100?nm. The control of the refractive index into GaN is therefore fundamental for the design of active and passive optical devices.

  12. Optimal composition of europium gallium oxide thin films for device applications

    SciTech Connect (OSTI)

    Wellenius, P.; Muth, J. F. [Department of Electrical and Computer Engineering, North Carolina State University, Raleigh, North Carolina 27695 (United States); Smith, E. R. [Kratos Defense and Security Solutions, Inc., 5030 Bradford Drive, Huntsville, Alabama 35805 (United States); LeBoeuf, S. M. [Valencell, Inc., 920 Main Campus Drive, Raleigh, North Carolina 27615 (United States); Everitt, H. O. [Army Aviation and Missile RD and E Center, Redstone Arsenal, Alabama 35898 (United States) and Department of Physics, Duke University, Durham, North Carolina 27708 (United States)

    2010-05-15T23:59:59.000Z

    Europium gallium oxide (Eu{sub x}Ga{sub 1-x}){sub 2}O{sub 3} thin films were deposited on sapphire substrates by pulsed laser deposition with varying Eu content from x=2.4 to 20 mol %. The optical and physical effects of high europium concentration on these thin films were studied using photoluminescence (PL) spectroscopy, x-ray diffraction (XRD), and Rutherford backscattering spectrometry. PL spectra demonstrate that emission due to the {sup 5}D{sub 0} to {sup 7}F{sub J} transitions in Eu{sup 3+} grows linearly with Eu content up to 10 mol %. Time-resolved PL indicates decay parameters remain similar for films with up to 10 mol % Eu. At 20 mol %, however, PL intensity decreases substantially and PL decay accelerates, indicative of parasitic energy transfer processes. XRD shows films to be polycrystalline and beta-phase for low Eu compositions. Increasing Eu content beyond 5 mol % does not continue to modify the film structure and thus, changes in PL spectra and decay cannot be attributed to structural changes in the host. These data indicate the optimal doping for optoelectronic devices based on (Eu{sub x}Ga{sub 1-x}){sub 2}O{sub 3} thin films is between 5 and 10 mol %.

  13. Picosecond spin relaxation in low-temperature-grown GaAs

    SciTech Connect (OSTI)

    Uemura, M.; Honda, K.; Yasue, Y.; Tackeuchi, A., E-mail: atacke@waseda.jp [Department of Applied Physics, Waseda University, Tokyo 169-8555 (Japan); Lu, S. L.; Dai, P. [Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Science, Suzhou (China)

    2014-03-24T23:59:59.000Z

    The spin relaxation process of low-temperature-grown GaAs is investigated by spin-dependent pump and probe reflectance measurements with a sub-picosecond time resolution. Two very short carrier lifetimes of 2.0 ps and 28 ps, which can be attributed to nonradiative recombinations related to defects, are observed at 10?K. The observed spin polarization shows double exponential decay with spin relaxation times of 46.2 ps (8.0 ps) and 509 ps (60 ps) at 10?K (200?K). The observed picosecond spin relaxation, which is considerably shorter than that of conventional GaAs, indicates the strong relevance of the Elliott-Yafet process as the spin relaxation mechanism. For the first (second) spin relaxation component, the temperature and carrier density dependences of the spin relaxation time indicate that the Bir-Aronov-Pikus process is also effective at temperatures between 10?K and 77?K, and that the D'yakonov-Perel’ process is effective between 125?K (77?K) and 200?K.

  14. Surface Science Analysis of GaAs Photocathodes Following Sustained Electron Beam Delivery

    SciTech Connect (OSTI)

    Shutthanandan, V.; Zhu, Zihua; Stutzman, Marcy L.; Hannon, Fay; Hernandez-Garcia, Carlos; Nandasiri, Manjula I.; Kuchibhatla, Satyanarayana V N T; Thevuthasan, Suntharampillai; Hess, Wayne P.

    2012-06-12T23:59:59.000Z

    Degradation of the photocathode materials employed in photoinjectors represents a challenge for sustained operation of nuclear physics accelerators and high power Free Electron Lasers (FEL). Several photocathode degradation processes are suspected, including defect formation by ion back bombardment, photochemistry of surface adsorbed species and irradiation-induced surface defect formation. To better understand the mechanisms of photocathode degradation, we have conducted surface and bulk analysis studies of two GaAs photocathodes removed from the FEL photoinjector after delivering electron beam for a few years. The analysis techniques include Helium Ion Microscopy (HIM), Rutherford Backscattering Spectrometry (RBS), Atomic Force Microscopy (AFM) and Secondary Ion Mass Spectrometry (SIMS). In addition, strained super-lattice GaAs photocathode samples, removed from the CEBAF photoinjector were analyzed using Transmission Electron Microscopy (TEM) and SIMS. This analysis of photocathode degradation during nominal photoinjector operating conditions represents first steps towards developing robust new photocathode designs necessary for generating sub-micron emittance electron beams required for both fourth generation light sources and intense polarized CW electron beams for nuclear and high energy physics facilities.

  15. Bistability of self-modulation of the GaAs intrinsic stimulated picosecond radiation spectrum

    SciTech Connect (OSTI)

    Ageeva, N. N.; Bronevoi, I. L., E-mail: bil@cplire.ru; Zabegaev, D. N.; Krivonosov, A. N. [Russian Academy of Sciences, Kotel'nikov Institute of Radio Engineering and Electronics (Russian Federation)] [Russian Academy of Sciences, Kotel'nikov Institute of Radio Engineering and Electronics (Russian Federation)

    2013-08-15T23:59:59.000Z

    The bistability of self-modulation of the spectrum of the stimulated picosecond radiation that appears during picosecond optical pumping of GaAs is detected. The radiation is measured before it reaches the end faces of a sample. One set of equidistant modes occurs in the radiation spectrum at the radiation pulse front. A set of modes located at the center between the initial modes replaces the first set in the descending radiation branch. The intermode interval inside each set coincides with the calculated interval between the eigenmodes of the GaAs layer, which is an active cavity. The radiation rise time turns out to be an oscillating function of the photon energy. The spectrum evolution is self-consistent so that the time-integrated spectrum and the spectrum-integrated radiation pulse envelope have a smooth (without local singularities) shape. The revealed bistability explains the physical nature of the two radiation-induced states of population depletion between which subterahertz self-oscillations in the radiation field were detected earlier. The radiation spectrum self-modulation is assumed to be a variant of stimulated Raman scattering.

  16. Effect of catalyst diameter on vapour-liquid-solid growth of GaAs nanowires

    SciTech Connect (OSTI)

    O'Dowd, B. J., E-mail: odowdbj@tcd.ie; Shvets, I. V. [CRANN, School of Physics, Trinity College, the University of Dublin, Dublin D2 (Ireland); Wojtowicz, T.; Kolkovsky, V.; Wojciechowski, T.; Zgirski, M. [Institute of Physics, Polish Academy of Sciences, Warsaw 02-668 (Poland); Rouvimov, S. [Notre Dame Integrated Imaging Facility (NDIIF), University of Notre Dame, Notre Dame, Indiana 46556 (United States); Liu, X.; Pimpinella, R.; Dobrowolska, M.; Furdyna, J. [Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556 (United States)

    2014-08-14T23:59:59.000Z

    GaAs nanowires were grown on (111)B GaAs substrates using the vapour-liquid-solid mechanism. The Au/Pt nanodots used to catalyse wire growth were defined lithographically and had varying diameter and separation. An in-depth statistical analysis of the resulting nanowires, which had a cone-like shape, was carried out. This revealed that there were two categories of nanowire present, with differing height and tapering angle. The bimodal nature of wire shape was found to depend critically on the diameter of the Au-Ga droplet atop the nanowire. Transmission electron microscopy analysis also revealed that the density of stacking faults in the wires varied considerably between the two categories of wire. It is believed that the cause of the distinction in terms of shape and crystal structure is related to the contact angle between the droplet and the solid-liquid interface. The dependency of droplet diameter on contact angle is likely related to line-tension, which is a correction to Young's equation for the contact angle of a droplet upon a surface. The fact that contact angle may influence resulting wire structure and shape has important implications for the planning of growth conditions and the preparation of wires for use in proposed devices.

  17. Large-Signal HBT Model with Improved Collector Transit Time Formulation for GaAs and InP Technologies

    E-Print Network [OSTI]

    Asbeck, Peter M.

    mi': iaE Large-Signal HBT Model with Improved Collector Transit Time Formulation for GaAs and In large-signal HBT model which accurately accounts for the intricate hias dependence of collector delay collector delay function accounts for the variation of electron velocity with electric field

  18. X-ray imaging and diffraction from surface phonons on GaAs W. Sauer,a)

    E-Print Network [OSTI]

    Ludwig-Maximilians-Universität, München

    , the driver frequency of the synchrotron was multiplied 102 times by a phase-locked loop PLL , ampli- fied are excited on the GaAs 001 surface by using interdigital transducers, designed for frequencies of up to 900 to measured diffraction profiles at different excitation voltages, the SAW amplitudes were calculated

  19. Femtosecond-scale response of GaAs to ultrafast laser pulses Traian Dumitrica* and Roland E. Allen

    E-Print Network [OSTI]

    Allen, Roland E.

    Femtosecond-scale response of GaAs to ultrafast laser pulses Traian Dumitrica* and Roland E. Allen ordinary heating of the sample by phonon emission, there is convinc- ing evidence that ultrafast pulses of the initial stages of the interaction of a laser pulse with a semiconductor, which show that ultrafast disor

  20. All-optical generation and detection of subpicosecond ac spin-current pulses in GaAs

    E-Print Network [OSTI]

    Ruzicka, Brian Andrew; Higley, Karl; Werake, Lalani Kumari; Zhao, Hui

    2008-07-01T23:59:59.000Z

    Subpicosecond ac spin-current pulses are generated optically in GaAs bulk and quantum wells at room temperature and at 90 K through quantum interference between one-photon and two-photon absorptions driven by two phase-locked ultrafast laser pulses...

  1. Ultrafast (370 GHz bandwidth) p-i-n traveling wave photodetector using low-temperature-grown GaAs

    E-Print Network [OSTI]

    Bowers, John

    measured with a thermocouple temperature sensor and then in situ annealed at 590 °C for 10 min. We found photodetectors utilizing low-temperature-grown GaAs as the absorption layer. The electro-optically measured-efficiency product. By dis- tributing the RC elements and impedance matching to exter- nal circuits, both p

  2. Diffusion of a Ga adatom on the GaAs(001)c(44)heterodimer surface: A first principles study

    E-Print Network [OSTI]

    Khare, Sanjay V.

    Diffusion of a Ga adatom on the GaAs(001)c(4×4)heterodimer surface: A first principles study J Diffusion barriers Reconstruction Density functional calculations The adsorption and diffusion behavior functional theory (DFT) computations in the local density approxima- tion. Structural and bonding features

  3. I-V analysis of high-energy lithium-ion-irradiated Si and GaAs solar cells

    E-Print Network [OSTI]

    A. Meulenberg Jr; B. Jayashree; Ramani; M. C. Radhakrishna; A. K. Saif

    2007-09-07T23:59:59.000Z

    Space-grade Si and GaAs solar cells were irradiated with 15 and 40 MeV lithium ions. Dark-IV analysis (with and without illumination) reveals differences in the effects of such irradiation on the different cell types

  4. THIN FILM SOLAR CELLS AND A REVIEW OF RECENT RESULTS ON GaAs By PAUL RAPPAPORT,

    E-Print Network [OSTI]

    Paris-Sud XI, Université de

    154. THIN FILM SOLAR CELLS AND A REVIEW OF RECENT RESULTS ON GaAs By PAUL RAPPAPORT, RCA PHYSIQUE APPLIQUÃ?E TOME 1, SEPTEMBRE 1966, PAGE ' Two of the most urgent requirements of future solar cells are lower cost and lighter weight. Pre- sent cost of solar cells is in the s 200 to $ 400/watt range, which

  5. Material and device characterization toward high-efficiency GaAs solar cells on optical-grade polycrystalline Ge substrates

    SciTech Connect (OSTI)

    Venkatasubramanian, R.; Malta, D.P.; Timmons, M.L.; Posthill, J.B.; Hutchby, J.A. [Research Triangle Inst., Research Triangle Park, NC (United States); Ahrenkiel, R.; Keyes, B.; Wangensteen, T. [National Renewable Energy Lab., Golden, CO (United States)

    1994-12-31T23:59:59.000Z

    In this work, the authors present a detailed characterization of the material and device properties of GaAs materials grown on optical-grade poly-Ge substrates. Although the minority-carrier lifetime of the starting optical-grade polycrystalline Ge substrate is about a factor of 8 less than that measured in single-crystal electronic-grade Ge, the minority carrier lifetime in GaAs-AlGaAs double-hetero (DH) structures grown on these two substrates were about comparable. C-V measurements on poly-GaAs p{sup +}n junctions indicate negligible role of grain-boundaries in majority-carrier trapping and also that no compensating deep levels were introduced into the n-GaAs active layers from the optical-grade substrates. The polycrystalline GaAs p{sup +}-n junctions were evaluated by dark In I-V measurements and the authors observed that there is a considerable variation of the saturation dark current density (within a factor of ten) of diodes located in various grains. The performance of the poly p{sup +}n GaAs cells is improved by the introduction of an undoped spacer in the p{sup +}-n junction. Diode I-V data of p{sup +}-n GaAs junctions, grown with this spacer, show a factor of near 100 reduction in diode saturation dark-current density. The reduction in dark current is believed to be associated with the reduction of tunneling currents in the depletion-layer of the p{sup +}-n junction in polycrystalline materials. Since the series resistance of the lightly-doped substrate is presently limiting the efficiency of large-area cells, efforts are underway to develop GaAs solar cells on more heavily-doped poly-Ge substrates.

  6. Shear strain mediated magneto-electric effects in composites of piezoelectric lanthanum gallium silicate or tantalate and ferromagnetic alloys

    SciTech Connect (OSTI)

    Sreenivasulu, G.; Piskulich, E.; Srinivasan, G., E-mail: srinivas@oakland.edu [Physics Department, Oakland University, Rochester, Michigan 48409 (United States); Qu, P.; Qu, Hongwei [Electrical and Computer Engineering, Oakland University, Rochester, Michigan 48309 (United States); Petrov, V. M. [Institute of Electronic Information Systems, Novgorod State University, Veliky Novgorod (Russian Federation); Fetisov, Y. K. [Moscow State Technical University of Radio Engineering, Electronics and Automation, Moscow 19454 (Russian Federation); Nosov, A. P. [Institute of Metal Physics, Ural Division of Russian Academy of Sciences, 18 S. Kovalevskaya St, Ekaterinburg 620990 (Russian Federation)

    2014-07-21T23:59:59.000Z

    Shear strain mediated magneto-electric (ME) coupling is studied in composites of piezoelectric Y-cut lanthanum gallium silicate (LGS) or tantalate (LGT) and ferromagnetic Fe-Co-V alloys. It is shown that extensional strain does not result in ME effects in these layered composites. Under shear strain generated by an ac and dc bias magnetic fields along the length and width of the sample, respectively, strong ME coupling is measured at low-frequencies and at mechanical resonance. A model is discussed for the ME effects. These composites of Y-cut piezoelectrics and ferromagnetic alloys are of importance for shear strain based magnetic field sensors.

  7. A numerical simulation study of gallium-phosphide/silicon heterojunction passivated emitter and rear solar cells

    SciTech Connect (OSTI)

    Wagner, Hannes [Department of Solar Energy, Institute Solid-State Physics, Leibniz University of Hannover, Appelstr. 2, 30167 Hannover (Germany); ARC Photovoltaics Centre of Excellence, University of New South Wales (UNSW), Sydney, NSW 2052 (Australia); Ohrdes, Tobias [Institute for Solar Energy Research Hamelin (ISFH), 31860 Emmerthal (Germany); Dastgheib-Shirazi, Amir [Div. Photovoltaics, Department of Physics, University of Konstanz, 78457 Konstanz (Germany); Puthen-Veettil, Binesh; König, Dirk [ARC Photovoltaics Centre of Excellence, University of New South Wales (UNSW), Sydney, NSW 2052 (Australia); Altermatt, Pietro P. [Department of Solar Energy, Institute Solid-State Physics, Leibniz University of Hannover, Appelstr. 2, 30167 Hannover (Germany)

    2014-01-28T23:59:59.000Z

    The performance of passivated emitter and rear (PERC) solar cells made of p-type Si wafers is often limited by recombination in the phosphorus-doped emitter. To overcome this limitation, a realistic PERC solar cell is simulated, whereby the conventional phosphorus-doped emitter is replaced by a thin, crystalline gallium phosphide (GaP) layer. The resulting GaP/Si PERC cell is compared to Si PERC cells, which have (i) a standard POCl{sub 3} diffused emitter, (ii) a solid-state diffused emitter, or (iii) a high efficiency ion-implanted emitter. The maximum efficiencies for these realistic PERC cells are between 20.5% and 21.2% for the phosphorus-doped emitters (i)–(iii), and up to 21.6% for the GaP emitter. The major advantage of this GaP hetero-emitter is a significantly reduced recombination loss, resulting in a higher V{sub oc}. This is so because the high valence band offset between GaP and Si acts as a nearly ideal minority carrier blocker. This effect is comparable to amorphous Si. However, the GaP layer can be contacted with metal fingers like crystalline Si, so no conductive oxide is necessary. Compared to the conventional PERC structure, the GaP/Si PERC cell requires a lower Si base doping density, which reduces the impact of the boron-oxygen complexes. Despite the lower base doping, fewer rear local contacts are necessary. This is so because the GaP emitter shows reduced recombination, leading to a higher minority electron density in the base and, in turn, to a higher base conductivity.

  8. Real-time x-ray studies of gallium nitride nanodot formation by droplet heteroepitaxy

    SciTech Connect (OSTI)

    Wang Yiyi; Oezcan, Ahmet S.; Sanborn, Christopher; Ludwig, Karl F.; Bhattacharyya, Anirban; Chandrasekaran, Ramya; Moustakas, Theodore D.; Zhou Lin; Smith, David J. [Physics Department, Boston University, Boston, Massachusetts 02215 (United States); Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts 02215 (United States); Department of Physics, Arizona State University, Tempe, Arizona 85287, USA and School of Materials, Arizona State University, Tempe, Arizona 85287 (United States)

    2007-10-01T23:59:59.000Z

    Self-organized gallium nitride nanodots have been fabricated using droplet heteroepitaxy on c-plane sapphire by plasma-assisted molecular beam epitaxy at different substrate temperatures and Ga fluxes. Nanoscale Ga droplets were initially formed on the sapphire substrate at high temperatures by Ga deposition from an effusion cell in an ultrahigh vacuum growth chamber. Subsequently, the droplets were converted into GaN nanodots using a nitrogen plasma source. The process was monitored and controlled using real-time grazing-incidence small-angle x-ray scattering. The samples were examined postgrowth by in situ grazing incidence x-ray diffraction and reflection high-energy electron diffraction, which confirmed the epitaxial relationship between the GaN nanodots and the sapphire surface. X-ray diffraction indicated that the wurtzite phase was dominant at higher substrate temperature (710 deg. C), but a mixture of wurtzite and zinc blende phases was present at a substrate temperature of 620 deg. C. Ex situ atomic force microscopy and transmission electron microscopy analyses showed that the dot size distribution was bimodal. A thin GaN continuous layer of {approx} three monolayers thick was observed by transmission electron microscopy on the sample grown at a substrate temperature of 620 deg. C, but no such layer was observed for the substrate temperature of 710 deg. C. This suggests that there is little mobility of Ga atoms in contact with the sapphire substrate at the lower temperature so that they cannot easily diffuse to nearby droplets and instead form a thin layer covering the surface.

  9. Real-Time X-ray Studies of Gallium Nitride Nanodot Formation by Droplet Heteroepitaxy

    SciTech Connect (OSTI)

    Wang,Y.; Ozcan, A.; Sanborn, C.; Ludwig, K.; Bhattacharyya, A.; Chandrasekaran, R.; Moustakas, T.; Zhou, L.; Smith, D.

    2007-01-01T23:59:59.000Z

    Self-organized gallium nitride nanodots have been fabricated using droplet heteroepitaxy on c-plane sapphire by plasma-assisted molecular beam epitaxy at different substrate temperatures and Ga fluxes. Nanoscale Ga droplets were initially formed on the sapphire substrate at high temperatures by Ga deposition from an effusion cell in an ultrahigh vacuum growth chamber. Subsequently, the droplets were converted into GaN nanodots using a nitrogen plasma source. The process was monitored and controlled using real-time grazing-incidence small-angle x-ray scattering. The samples were examined postgrowth by in situ grazing incidence x-ray diffraction and reflection high-energy electron diffraction, which confirmed the epitaxial relationship between the GaN nanodots and the sapphire surface. X-ray diffraction indicated that the wurtzite phase was dominant at higher substrate temperature (710? C), but a mixture of wurtzite and zinc blende phases was present at a substrate temperature of 620? C. Ex situ atomic force microscopy and transmission electron microscopy analyses showed that the dot size distribution was bimodal. A thin GaN continuous layer of ? three monolayers thick was observed by transmission electron microscopy on the sample grown at a substrate temperature of 620? C, but no such layer was observed for the substrate temperature of 710? C. This suggests that there is little mobility of Ga atoms in contact with the sapphire substrate at the lower temperature so that they cannot easily diffuse to nearby droplets and instead form a thin layer covering the surface.

  10. Fano Resonance in GaAs 2D Photonic Crystal Nanocavities

    SciTech Connect (OSTI)

    Valentim, P. T.; Guimaraes, P.S. S. [Departamento de Fisica, Universidade Federal de Minas Gerais, Belo Horizonte (Brazil); Instituto Nacional de Ciencia e Tecnologia de Nanodispositivos Semicondutores - INCT-DISSE (Brazil); Luxmoore, I. J.; Szymanski, D.; Whittaker, D. M.; Fox, A. M.; Skolnick, M. S. [Department of Physics and Astronomy, University of Sheffield, Sheffield (United Kingdom); Vasco, J. P. [Instituto de Fisica, Universidad de Antioquia, Medellin (Colombia); Vinck-Posada, H. [Departamento de Fisica, Facultad de Ciencias, Universidad Nacional de Colombia, Bogota (Colombia)

    2011-12-23T23:59:59.000Z

    We report the results of polarization resolved reflectivity experiments in GaAs air-bridge photonic crystals with L3 cavities. We show that the fundamental L3 cavity mode changes, in a controlled way, from a Lorentzian symmetrical lineshape to an asymmetrical form when the linear polarization of the incident light is rotated in the plane of the crystal. The different lineshapes are well fitted by the Fano asymmetric equation, implying that a Fano resonance is present in the reflectivity. We use the scattering matrix method to model the Fano interference between a localized discrete state (the cavity fundamental mode) and a background of continuum states (the light reflected from the crystal slab in the vicinity of the cavity) with very good agreement with the experimental data.

  11. Real-time reflectance-difference spectroscopy of GaAs molecular beam epitaxy homoepitaxial growth

    SciTech Connect (OSTI)

    Lastras-Martínez, A., E-mail: alm@cactus.iico.uaslp.mx, E-mail: alastras@gmail.com; Ortega-Gallegos, J.; Guevara-Macías, L. E.; Nuñez-Olvera, O.; Balderas-Navarro, R. E.; Lastras-Martínez, L. F. [Instituto de Investigación en Comunicación Optica, Universidad Autónoma de San Luis Potosí, Alvaro Obregón 64, San Luis Potosí, SLP 78000 (Mexico); Lastras-Montaño, L. A. [IBM T. J. Watson Research Center, Yorktown Heights, New York 10598 (United States); Lastras-Montaño, M. A. [Department of Electrical and Computer Engineering, University of California, Santa Barbara, Santa Barbara, California 93106 (United States)

    2014-03-01T23:59:59.000Z

    We report on real time-resolved Reflectance-difference (RD) spectroscopy of GaAs(001) grown by molecular beam epitaxy, with a time-resolution of 500 ms per spectrum within the 2.3–4.0 eV photon energy range. Through the analysis of transient RD spectra we demonstrated that RD line shapes are comprised of two components with different physical origins and determined their evolution during growth. Such components were ascribed to the subsurface strain induced by surface reconstruction and to surface stoichiometry. Results reported in this paper render RD spectroscopy as a powerful tool for the study of fundamental processes during the epitaxial growth of zincblende semiconductors.

  12. High quality molecular beam epitaxial growth on patterned GaAs substrates

    SciTech Connect (OSTI)

    Smith, J.S.; Derry, P.L.; Margalit, S.; Yariv, A.

    1985-10-01T23:59:59.000Z

    In this letter we describe a procedure for high quality molecular beam epitaxy (MBE) growth over finely patterned GaAs substrates which is suitable for device fabrication requiring lateral definition of small (approx.1--2 ..mu..m) dimension. This method was used for the fabrication of index guided laser arrays. Yields of individual lasers exceeded 90%, and thresholds were uniform to 10%. Temperature and flux ratio dependence of faceting during MBE growth over patterned substrates is shown for temperatures ranging from 580 to 700 /sup 0/C and for As/Ga flux ratios from 1.4:1 to 4:1. The real index guided structure, which can be formed by a single MBE growth over a ridged substrate, is discussed. This technique should prove useful in the fabrication of devices which take advantage of unique features formed during regrowth by MBE.

  13. Charge tuning in [111] grown GaAs droplet quantum dots

    SciTech Connect (OSTI)

    Bouet, L.; Vidal, M.; Marie, X.; Amand, T.; Wang, G.; Urbaszek, B. [INSA-CNRS-UPS, LPCNO, Université de Toulouse, 135 Ave. Rangueil, 31077 Toulouse (France); Mano, T.; Ha, N.; Kuroda, T.; Sakoda, K. [National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044 (Japan); Durnev, M. V.; Glazov, M. M.; Ivchenko, E. L. [Ioffe Physical-Technical Institute RAS, 194021 St.-Petersburg (Russian Federation)

    2014-08-25T23:59:59.000Z

    We demonstrate charge tuning in strain free GaAs/AlGaAs quantum dots (QDs) grown by droplet epitaxy on a GaAs(111)A substrate. Application of a bias voltage allows the controlled charging of the QDs from ?3|e| to +2|e|. The resulting changes in QD emission energy and exciton fine-structure are recorded in micro-photoluminescence experiments at T?=?4?K. We uncover the existence of excited valence and conduction states, in addition to the s-shell-like ground state. We record a second series of emission lines about 25?meV above the charged exciton emission coming from excited charged excitons. For these excited interband transitions, a negative diamagnetic shift of large amplitude is uncovered in longitudinal magnetic fields.

  14. Photoluminescence of GaAs films grown by vacuum chemical epitaxy

    SciTech Connect (OSTI)

    Bernussi, A.A.; Barreto, C.L.; Carvalho, M.M.G.; Motisuke, P.

    1988-08-01T23:59:59.000Z

    GaAs layers grown by vacuum chemical epitaxy (VCE) are investigated by low-temperature photoluminescence. A qualitative relation between the growth parameters and the shallow-impurity-incorporation mechanism is established. It was observed that the predominant shallow acceptor is carbon, and its incorporation during the growth process decreases with the As:Ga ratio, increases with growth temperature until 750 /sup 0/C, and then it diminishes. In this work we compare the characteristics observed in the VCE system with those in conventional molecular-beam epitaxy (MBE) and metalorganic chemical vapor deposition (MOCVD). Our results show that this system contains some advantages from both the MBE and MOCVD systems. The photoluminescence spectra also show that at low As:Ga ratios the generation of As vacancies or its complexes is strongly enhanced.

  15. Molecular-beam epitaxial growth of boron-doped GaAs films

    SciTech Connect (OSTI)

    Hoke, W.E.; Lemonias, P.J.; Weir, D.G. [Raytheon Research Division, Lexington, MA (United States)] [and others] [Raytheon Research Division, Lexington, MA (United States); and others

    1993-05-01T23:59:59.000Z

    GaAs films doped with boron in the 10{sup 20} cm{sup {minus}3} range were grown by solid source molecular-beam epitaxy. Lattice contractions were observed in x-ray double crystal spectra. Substitutional boron concentrations up to 1.7x10{sup 20} cm{sup {minus}3} were obtained with narrow x-ray linewidths and specular surface morphology. For a given boron flux, the substitutional concentration was dependent on growth temperature. P-type conductivity due to boron incorporation was measured in the films with hole concentration reaching 1x10{sup 19} cm{sup {minus}3}. The lattice contractions exhibited good thermal stability for rapid thermal anneals. 10 refs., 3 figs., 2 tabs.

  16. Evolution of superclusters and delocalized states in GaAs1–xNx

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Fluegel, B.; Alberi, K.; Beaton, D. A.; Crooker, S. A.; Ptak, A. J.; Mascarenhas, A.

    2012-11-01T23:59:59.000Z

    The evolution of individual nitrogen cluster bound states into an extended state infinite supercluster in dilute GaAs1–xNx was probed through temperature and intensity-dependent, time-resolved and magnetophotoluminescence (PL) measurements. Samples with compositions less than 0.23% N exhibit PL behavior that is consistent with emission from the extended states of the conduction band. Near a composition of 0.23% N, a discontinuity develops between the extended state PL peak energy and the photoluminescence excitation absorption edge. The existence of dual localized/delocalized state behavior near this composition signals the formation of an N supercluster just below the conduction band edge. The infinite supercluster is fully developed by 0.32% N.

  17. Epitaxial lift-off of quantum dot enhanced GaAs single junction solar cells

    SciTech Connect (OSTI)

    Bennett, Mitchell F.; Bittner, Zachary S.; Forbes, David V.; Hubbard, Seth M., E-mail: smhsps@rit.edu [Rochester Institute of Technology, Rochester, New York 14623 (United States); Rao Tatavarti, Sudersena; Wibowo, Andree; Pan, Noren; Chern, Kevin [MicroLink Devices, Inc., Niles, Illinois 60714 (United States)] [MicroLink Devices, Inc., Niles, Illinois 60714 (United States); Phillip Ahrenkiel, S. [South Dakota School of Mines and Technology, Rapid City, South Dakota 57701 (United States)] [South Dakota School of Mines and Technology, Rapid City, South Dakota 57701 (United States)

    2013-11-18T23:59:59.000Z

    InAs/GaAs strain-balanced quantum dot (QD) n-i-p solar cells were fabricated by epitaxial lift-off (ELO), creating thin and flexible devices that exhibit an enhanced sub-GaAs bandgap current collection extending into the near infrared. Materials and optical analysis indicates that QD quality after ELO processing is preserved, which is supported by transmission electron microscopy images of the QD superlattice post-ELO. Spectral responsivity measurements depict a broadband resonant cavity enhancement past the GaAs bandedge, which is due to the thinning of the device. Integrated external quantum efficiency shows a QD contribution to the short circuit current density of 0.23?mA/cm{sup 2}.

  18. Measurement of electron beam polarization from unstrained GaAs via two-photon photoemission

    SciTech Connect (OSTI)

    McCarter, James L. [Univ. of Virginia, Charlottesville, VA (United States); Afanasev, A. [George Washington Univ., Washingon, DC (United States); Gay, T. J. [Univ. of Nebraska, Lincoln, NE (United States); Hansknecht, John C. [JLAB, Newport News, VA (United States); Kechiantz, A. [George Washington Univ., Washingon, DC (United States); Poelker, B. Matthew [JLAB, Newport News, VA (United States)

    2014-02-01T23:59:59.000Z

    Two-photon absorption of 1560 nm light was used to generate polarized electron beams from unstrained GaAs photocathodes of varying thickness: 625 {mu}m, 0.32 {mu}m, and 0.18 {mu}m. For each photocathode, the degree of spin polarization of the photoemitted beam was less than 50%, contradicting earlier predictions based on simple quantum mechanical selection rules for spherically-symmetric systems but consistent with the more sophisticated model of Bhat et al. (Phys. Rev. B 71 (2005) 035209). Polarization via two-photon absorption was the highest from the thinnest photocathode sample and comparable to that obtained via one-photon absorption (using 778 nm light), with values 40.3 +- 1.0% and 42.6 +- 1.0%, respectively.

  19. High quality metamorphic graded buffers with lattice-constants intermediate to GaAs an InP for device applications

    E-Print Network [OSTI]

    Lee, Kenneth Eng Kian

    2009-01-01T23:59:59.000Z

    We have investigated the use of a continuous, linear grading scheme for compositionally-graded metamorphic InxGal-As buffers on GaAs, which can be used as virtual substrates for optical emitters operating at wavelengths > ...

  20. Energy distribution of nonequilibrium electrons and optical phonons in GaAs under band-to-band pumping by intense short pulses of light

    SciTech Connect (OSTI)

    Altybaev, G. S.; Kumekov, S. E., E-mail: skumekov@mail.ru; Mahmudov, A. A. [Satpaev Kazakh National Technical University (Kazakhstan)

    2009-03-15T23:59:59.000Z

    Deviation from the Fermi distribution of nonequilibrium electrons and distribution of 'hot' optical phonons in GaAs under band-to-band pumping by picosecond pulses of light are calculated.

  1. Simulation of quantum dots size and spacing effect for intermediate band solar cell application based on InAs quantum dots arrangement in GaAs

    SciTech Connect (OSTI)

    Hendra, P. I. B., E-mail: ib.hendra@gmail.com; Rahayu, F., E-mail: ib.hendra@gmail.com; Darma, Y., E-mail: ib.hendra@gmail.com [Physical Vapor Deposition Laboratory, Physics of Material Electronics Research, Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Jl. Ganesha 10, Bandung 40132 (Indonesia)

    2014-03-24T23:59:59.000Z

    Intermediate band solar cell (IBSC) has become a promising technology in increasing solar cell efficiency. In this work we compare absorption coefficient profile between InAs quantum dots with GaAs bulk. We calculate the efficiency of GaAs bulk and GaAs doped with 2, 5, and 10 nm InAs quantum dot. Effective distances in quantum dot arrangement based on electron tunneling consideration were also calculated. We presented a simple calculation method with low computing power demand. Results showed that arrangement of quantum dot InAs in GaAs can increase solar cell efficiency from 23.9 % initially up to 60.4%. The effective distance between two quantum dots was found 2 nm in order to give adequate distance to prevent electron tunneling and wave functions overlap.

  2. Piezoelectric surface acoustical phonon amplification in graphene on a GaAs substrate

    SciTech Connect (OSTI)

    Nunes, O. A. C., E-mail: oacn@unb.br [Institute of Physics, University of Brasilia, Brasilia, 70910-900 DF (Brazil)

    2014-06-21T23:59:59.000Z

    We study the interaction of Dirac Fermions in monolayer graphene on a GaAs substrate in an applied electric field by the combined action of the extrinsic potential of piezoelectric surface acoustical phonons of GaAs (piezoelectric acoustical (PA)) and of the intrinsic deformation potential of acoustical phonons in graphene (deformation acoustical (DA)). We find that provided the dc field exceeds a threshold value, emission of piezoelectric (PA) and deformation (DA) acoustical phonons can be obtained in a wide frequency range up to terahertz at low and high temperatures. We found that the phonon amplification rate R{sup PA,DA} scales with T{sub BG}{sup S?1} (S=PA,DA), T{sub BG}{sup S} being the Block?Gru{sup ¨}neisen temperature. In the high-T Block?Gru{sup ¨}neisen regime, extrinsic PA phonon scattering is suppressed by intrinsic DA phonon scattering, where the ratio R{sup PA}/R{sup DA} scales with ?1/?(n), n being the carrier concentration. We found that only for carrier concentration n?10{sup 10}cm{sup ?2}, R{sup PA}/R{sup DA}>1. In the low-T Block?Gru{sup ¨}neisen regime, and for n=10{sup 10}cm{sup ?2}, the ratio R{sup PA}/R{sup DA} scales with T{sub BG}{sup DA}/T{sub BG}{sup PA}?7.5 and R{sup PA}/R{sup DA}>1. In this regime, PA phonon dominates the electron scattering and R{sup PA}/R{sup DA}<1 otherwise. This study is relevant to the exploration of the acoustic properties of graphene and to the application of graphene as an acoustical phonon amplifier and a frequency-tunable acoustical phonon device.

  3. Synthesis of Germanium-Gallium-Tellurium (Ge-Ga-Te) ceramics by ball-milling and sintering Mathieu Hubert, Elena Petracovschi, Xiang-Hua Zhang and Laurent Calvez*

    E-Print Network [OSTI]

    Paris-Sud XI, Université de

    Synthesis of Germanium-Gallium-Tellurium (Ge-Ga-Te) ceramics by ball-milling and sintering Mathieu, France *laurent.calvez@univ-rennes1.fr Tel: (33) 2 23 23 67 13 Fax: (33) 2 23 23 56 11 Abstract, the semiconductor behavior of CdTe is exploited for the production of solar panels [1, 2], the rapid and reversible

  4. Formation of copper-indium-selenide and/or copper-indium-gallium-selenide films from indium selenide and copper selenide precursors

    DOE Patents [OSTI]

    Curtis, Calvin J. (Lakewood, CO); Miedaner, Alexander (Boulder, CO); Van Hest, Maikel (Lakewood, CO); Ginley, David S. (Evergreen, CO); Nekuda, Jennifer A. (Lakewood, CO)

    2011-11-15T23:59:59.000Z

    Liquid-based indium selenide and copper selenide precursors, including copper-organoselenides, particulate copper selenide suspensions, copper selenide ethylene diamine in liquid solvent, nanoparticulate indium selenide suspensions, and indium selenide ethylene diamine coordination compounds in solvent, are used to form crystalline copper-indium-selenide, and/or copper indium gallium selenide films (66) on substrates (52).

  5. Atomic layer structure of manganese atoms on wurtzite gallium nitride Abhijit Chinchore, Kangkang Wang, Wenzhi Lin, Jeongihm Pak, and Arthur R. Smitha

    E-Print Network [OSTI]

    Atomic layer structure of manganese atoms on wurtzite gallium nitride ,,0001¯... Abhijit Chinchore on wurtzite GaN 0001¯ . The surface is monitored using reflection high energy electron diffraction, which to grow with an abrupt interface and well- defined epitaxial orientation on top of wurtzite w -GaN. Re

  6. innovati nNREL Scientists Spurred the Success of Multijunction Solar Cells

    E-Print Network [OSTI]

    innovati nNREL Scientists Spurred the Success of Multijunction Solar Cells Before 1984, many a solar cell can convert into electricity. Olson thought the focus should change to finding materials-winning gallium indium phosphide/gallium arsenide tandem solar cell, which had achieved record efficiencies, con

  7. Measurement of the solar neutrino capture rate with gallium metal, part III

    SciTech Connect (OSTI)

    Elliott, Steven Ray [Los Alamos National Laboratory

    2008-01-01T23:59:59.000Z

    The Russian-American experiment SAGE began to measure the solar neutrino capture rate with a target of gallium metal in December 1989. Measurements have continued with only a few brief interruptions since that time. In this article we present the experimental improvements in SAGE since its last published data summary in December 2001. Assuming the solar neutrino production rate was constant during the period of data collection, combined analysis of 168 extractions through December 2007 gives a capture rate of solar neutrinos with energy more than 233 keY of 65.4{sup +3.1}{sub 3.0} (stat) {sup +2.6}{sub -2.8} (syst) SNU. The weighted average of the results of all three Ga solar neUlrino experiments, SAGE, Gallex, and GNO, is now 66.1 {+-} 3.1 SNU, where statistical and systematic uncertainties have been combined in quadrature. During the recent period of data collection a new test of SAGE was made with a reactor-produced {sup 37}Ar neutrino source. The ratio of observed to calculated rates in this experiment, combined with the measured rates in the three prior {sup 51}Cr neutrino-source experiments with Ga, is 0.88 {+-} 0.05. A probable explanation for this low result is that the cross section for neutrino capture by the two lowest-lying excited states in {sup 71}Ge has been overestimated. If we assume these cross sections are zero, then the standard solar model including neutrino oscillations predicts a total capture rate in Ga in the range of 63--67 SNU with an uncertainly of about 5%, in good agreement with experiment. We derive the current value of the pp neutrino flux produced in the Sun to be {phi}{sup {circle_dot}}{sub pp} = (6.1 {+-} 0.8) x 10{sup 10}/(cm{sup 2} s), which agrees well with the flux predicted by the standard solar model. Finally, we make several tests and show that the data are consistent with the assumption that the solar neutrino production rate is constant in time.

  8. Highly uniform, multi-stacked InGaAs/GaAs quantum dots embedded in a GaAs nanowire

    SciTech Connect (OSTI)

    Tatebayashi, J., E-mail: tatebaya@iis.u-tokyo.ac.jp; Ota, Y. [NanoQUINE, The University of Tokyo, 4-6-1, Komaba, Meguro-ku, Tokyo 153-8505 (Japan); Ishida, S.; Nishioka, M.; Iwamoto, S.; Arakawa, Y. [NanoQUINE, The University of Tokyo, 4-6-1, Komaba, Meguro-ku, Tokyo 153-8505 (Japan); Institute of Industrial Science, The University of Tokyo, 4-6-1, Komaba, Meguro-ku, Tokyo 153-8505 (Japan)

    2014-09-08T23:59:59.000Z

    We demonstrate a highly uniform, dense stack of In{sub 0.22}Ga{sub 0.78}As/GaAs quantum dot (QD) structures in a single GaAs nanowire (NW). The size (and hence emission energy) of individual QD is tuned by careful control of the growth conditions based on a diffusion model of morphological evolution of NWs and optical characterization. By carefully tailoring the emission energies of individual QD, dot-to-dot inhomogeneous broadening of QD stacks in a single NW can be as narrow as 9.3?meV. This method provides huge advantages over traditional QD stack using a strain-induced Stranski-Krastanow growth scheme. We show that it is possible to fabricate up to 200 uniform QDs in single GaAs NWs using this growth technique without degradation of the photoluminescence intensity.

  9. Atomic-scale observation of parallel development of super elasticity and reversible plasticity in GaAs nanowires

    SciTech Connect (OSTI)

    Bao, Peite; Du, Sichao; Zheng, Rongkun, E-mail: rongkun.zheng@sydney.edu.au [School of Physics, The University of Sydney, Sydney, NSW 2006 (Australia); Wang, Yanbo; Liao, Xiaozhou, E-mail: xiaozhou.liao@sydney.edu.au [School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006 (Australia); Cui, Xiangyuan; Yen, Hung-Wei; Kong Yeoh, Wai; Ringer, Simon P. [School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006 (Australia); Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006 (Australia); Gao, Qiang; Hoe Tan, H.; Jagadish, Chennupati [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200 (Australia); Liu, Hongwei [Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW 2006 (Australia); Zou, Jin [Materials Engineering and Centre for Microscopy and Microanalysis, The University of Queensland, Brisbane, QLD 4072 (Australia)

    2014-01-13T23:59:59.000Z

    We report the atomic-scale observation of parallel development of super elasticity and reversible dislocation-based plasticity from an early stage of bending deformation until fracture in GaAs nanowires. While this phenomenon is in sharp contrast to the textbook knowledge, it is expected to occur widely in nanostructures. This work indicates that the super recoverable deformation in nanomaterials is not simple elastic or reversible plastic deformation in nature, but the coupling of both.

  10. Influence of uniaxial pressure on the critical temperature for long delays in GaAs junction lasers

    SciTech Connect (OSTI)

    Morosini, M.B.Z.; Patel, N.B.; Nunes, F.D.

    1980-09-01T23:59:59.000Z

    In this work we report on the influence of uniaxial pressure applied perpendicularly to junction laser on the behavior of the critical temperature for the onset of long delays in GaAs junction lasers. Experimental data showing this influence for lasers operating in a TE or TM polarization are presented and explained on the basis of a thermal theory of long delays and related phenomena.

  11. Cryogenic on-wafer microwave characterization of GaAs MESFETs and superconducting coplanar resonance and transmission lines structures

    SciTech Connect (OSTI)

    Kruse, J.; Schweinfurth, R.A.; Gao, F.; Scherrer, D.; Barlage, D.; Platt, C.E.; Van Harlingen, D.J.; Feng, M. [Univ. of Illinois, Urbana, IL (United States)

    1994-12-31T23:59:59.000Z

    This work directly compares coplanar superconducting transmission lines and single-pole resonators patterned from YBCO to aluminum structures for use in GaAs/YBCO hybrid circuitry. A cryogenic on-wafer station was used to make s-parameter measurements of passive coplanar circuits as well as to characterize the performance of GaAs MESFETs at 80K. Comparisons were made between measured data and theoretical results for passive YBCO and Aluminum structures. The YBCO film was also measured using a parallel plate technique to determine microwave surface resistance to establish a correlation between patterned film and thin film microwave properties. Small-signal models were constructed to accurately predict the operation of 0.25{mu}m gate length GaAs MESFETs at 80 K under a variety of bias conditions. The cutoff frequency and maximum frequency of operation of the GaAs MESFETs increased by 29% and 13% respectively under a drain-source voltage of 2.0 V (Id = 100%Idss) as the temperature was lowered from 300K to 80K.

  12. dc field-emission analysis of GaAs and plasma-source ion-implanted stainless steel

    SciTech Connect (OSTI)

    C. Hernandez; T. Wang; T. Siggins; D. Bullard; H. F. Dylla; C. Reece; N. D. Theodore; D. M. Manos

    2003-06-01T23:59:59.000Z

    Field-emission studies have been performed on a GaAs wafer and a sample of its stainless-steel (SS) support electrode that are part of a photocathode gun for the 10 kW Upgrade infrared free electron laser at Jefferson Lab. The objective of the studies presented here is to characterize the effect of both the cleanliness of the wafer and the plasma-source ion-implanted layer on the electrode to suppress field emission. Field emission is the limiting factor to achieve the required 6 MV/m at the surface of the wafer. Potential field emitters are first located on the surface of 1 in. diameter samples with a dc scanning field-emission microscope at 60 MV/m, then each emitter is characterized in a scanning electron microscope equipped with an energy dispersive spectrometer. The GaAs wafer was hydrogen cleaned before the study. The results show three emitters caused by indium contamination during wafer handling. The GaAs wafer thus shows good high-voltage characteristics and the need to maintain cleanliness during handling. The SS sample is hand polished with diamond paste to a 1-m surface finish, then implanted with N2/SiO2 in a plasma-source ion-implantation chamber in preparation for the field-emission studies.

  13. High-performance amorphous gallium indium zinc oxide thin-film transistors through N{sub 2}O plasma passivation

    SciTech Connect (OSTI)

    Park, Jaechul; Kim, Sangwook; Kim, Changjung; Kim, Sunil; Song, Ihun; Yin, Huaxiang; Kim, Kyoung-Kok; Lee, Sunghoon; Hong, Kiha; Park, Youngsoo [Semiconductor Device Laboratory, Samsung Advanced Institute of Technology, Yongin-Si, Gyeonggi-Do 449-712 (Korea, Republic of); Lee, Jaecheol; Jung, Jaekwan; Lee, Eunha [Analytical Engineering Center, Samsung Advanced Institute of Technology, Yongin-Si, Gyeonggi-Do 449-712 (Korea, Republic of); Kwon, Kee-Won [Department of Semiconductor Systems Engineering, Sungkyunkwan University, Suwon-Si, Gyeonggi-Do 440-746 (Korea, Republic of)

    2008-08-04T23:59:59.000Z

    Amorphous-gallium-indium-zinc-oxide (a-GIZO) thin filmtransistors (TFTs) are fabricated without annealing, using processes and equipment for conventional a-Si:H TFTs. It has been very difficult to obtain sound TFT characteristics, because the a-GIZO active layer becomes conductive after dry etching the Mo source/drain electrode and depositing the a-SiO{sub 2} passivation layer. To prevent such damages, N{sub 2}O plasma is applied to the back surface of the a-GIZO channel layer before a-SiO{sub 2} deposition. N{sub 2}O plasma-treated a-GIZO TFTs exhibit excellent electrical properties: a field effect mobility of 37 cm{sup 2}/V s, a threshold voltage of 0.1 V, a subthreshold swing of 0.25 V/decade, and an I{sub on/off} ratio of 7.

  14. Compact, Interactive Electric Vehicle Charger: Gallium-Nitride Switch Technology for Bi-directional Battery-to-Grid Charger Applications

    SciTech Connect (OSTI)

    None

    2010-10-01T23:59:59.000Z

    ADEPT Project: HRL Laboratories is using gallium nitride (GaN) semiconductors to create battery chargers for electric vehicles (EVs) that are more compact and efficient than traditional EV chargers. Reducing the size and weight of the battery charger is important because it would help improve the overall performance of the EV. GaN semiconductors process electricity faster than the silicon semiconductors used in most conventional EV battery chargers. These high-speed semiconductors can be paired with lighter-weight electrical circuit components, which helps decrease the overall weight of the EV battery charger. HRL Laboratories is combining the performance advantages of GaN semiconductors with an innovative, interactive battery-to-grid energy distribution design. This design would support 2-way power flow, enabling EV battery chargers to not only draw energy from the power grid, but also store and feed energy back into it.

  15. Low-temperature growth of gallium nitride films by inductively coupled-plasma-enhanced reactive magnetron sputtering

    SciTech Connect (OSTI)

    Ni, Chih-Jui; Chau-Nan Hong, Franklin, E-mail: hong@mail.ncku.edu.tw [Department of Chemical Engineering, National Cheng Kung University, 1 University Road, Tainan 70101, Taiwan (China)

    2014-05-15T23:59:59.000Z

    Gallium nitride (GaN) films were grown on sapphire substrate by reactive magnetron sputtering. Inductively coupled-plasma (ICP) source was installed between the substrate holder and the sputtering target to increase the plasma density and the degree of ionization of nitrogen gas. Liquid Ga and Ar/N{sub 2} were used as the sputtering target and sputtering gases, respectively. X-ray diffraction measurements confirmed that the authors could grow high quality GaN crystallites at 500?°C. However, the crystalline GaN (0002) peak remained even by lowering the growth temperature down to 300?°C. The N:Ga ratio of the film grown at 500?°C was almost 1:1, and the nitrogen composition became higher toward the 1:1 N:Ga ratio with increasing the growth temperature. The high degree of ionization induced by ICP source was essential to the growth of high crystalline quality GaN films.

  16. Gas source molecular beam epitaxy of scandium nitride on silicon carbide and gallium nitride surfaces

    SciTech Connect (OSTI)

    King, Sean W., E-mail: sean.king@intel.com; Davis, Robert F. [Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695 (United States); Nemanich, Robert J. [Department of Physics, North Carolina State University, Raleigh, North Carolina 27695 (United States)

    2014-11-01T23:59:59.000Z

    Scandium nitride (ScN) is a group IIIB transition metal nitride semiconductor with numerous potential applications in electronic and optoelectronic devices due to close lattice matching with gallium nitride (GaN). However, prior investigations of ScN have focused primarily on heteroepitaxial growth on substrates with a high lattice mismatch of 7%–20%. In this study, the authors have investigated ammonia (NH{sub 3}) gas source molecular beam epitaxy (NH{sub 3}-GSMBE) of ScN on more closely lattice matched silicon carbide (SiC) and GaN surfaces (<3% mismatch). Based on a thermodynamic analysis of the ScN phase stability window, NH{sub 3}-GSMBE conditions of 10{sup ?5}–10{sup ?4} Torr NH{sub 3} and 800–1050?°C where selected for initial investigation. In-situ x-ray photoelectron spectroscopy (XPS) and ex-situ Rutherford backscattering measurements showed all ScN films grown using these conditions were stoichiometric. For ScN growth on 3C-SiC (111)-(?3?×??3)R30° carbon rich surfaces, the observed attenuation of the XPS Si 2p and C 1s substrate core levels with increasing ScN thickness indicated growth initiated in a layer-by-layer fashion. This was consistent with scanning electron microscopy (SEM) images of 100–200?nm thick films that revealed featureless surfaces. In contrast, ScN films grown on 3C-SiC (111)-(3?×?3) and 3C-SiC (100)-(3?×?2) silicon rich surfaces were found to exhibit extremely rough surfaces in SEM. ScN films grown on both 3C-SiC (111)-(?3?×??3)R30° and 2H-GaN (0001)-(1?×?1) epilayer surfaces exhibited hexagonal (1?×?1) low energy electron diffraction patterns indicative of (111) oriented ScN. X-ray diffraction ?-2? rocking curve scans for these same films showed a large full width half maximum of 0.29° (1047?arc sec) consistent with transmission electron microscopy images that revealed the films to be poly-crystalline with columnar grains oriented at ?15° to the [0001] direction of the 6H-SiC (0001) substrate. In-situ reflection electron energy loss spectroscopy measurements determined the band-gap for the NH{sub 3}-GSMBE ScN films to be 1.5?±?0.3 eV, and thermal probe measurements indicated all ScN films to be n-type. The four point probe sheet resistance of the ScN films was observed to increase with decreasing growth temperature and decreased with unintentional oxygen incorporation. Hg probe capacitance–voltage measurements indicated N{sub D}-N{sub A} decreased with decreasing growth temperature from 10{sup 19} to 10{sup 20}/cm{sup 3} for the lowest resistivity films to ?5?×?10{sup 16}/cm{sup 3} for the highest resistivity films. In-situ ultraviolet photoelectron spectroscopy measurements additionally showed the valence band maximum moving from 1.4 to 0.8 eV below the Fermi level with decreasing growth temperature consistent with the increased resistivity and reduction in carrier concentration. These results suggest that additional reductions in ScN carrier concentrations can be achieved via continued optimization of ScN growth conditions and selection of substrate orientation and surface termination.

  17. X-ray pump optical probe cross-correlation study of GaAs

    SciTech Connect (OSTI)

    Durbin, S.M.; Clevenger, T.; Graber, T.; Henning, R. (Purdue); (UC)

    2012-09-10T23:59:59.000Z

    Ultrafast dynamics in atomic, molecular and condensed-matter systems are increasingly being studied using optical-pump, X-ray probe techniques where subpicosecond laser pulses excite the system and X-rays detect changes in absorption spectra and local atomic structure. New opportunities are appearing as a result of improved synchrotron capabilities and the advent of X-ray free-electron lasers. These source improvements also allow for the reverse measurement: X-ray pump followed by optical probe. We describe here how an X-ray pump beam transforms a thin GaAs specimen from a strong absorber into a nearly transparent window in less than 100 ps, for laser photon energies just above the bandgap. We find the opposite effect - X-ray induced optical opacity - for photon energies just below the bandgap. This raises interesting questions about the ultrafast many-body response of semiconductors to X-ray absorption, and provides a new approach for an X-ray/optical cross-correlator for synchrotron and X-ray free-electron laser applications.

  18. Thermal stability of TaSi/sub x/-GaAs Schottky barriers in rapid thermal processing. [Self-aligned gate fabrication of GaAs MESFETs

    SciTech Connect (OSTI)

    Haynes, T.E.; Han, C.C.; Lau, S.S.; Picraux, S.T.; Chu, W.K.

    1987-01-01T23:59:59.000Z

    Co-sputtered TaSi/sub x/ films on GaAs have been examined as potential refractory Schottky barrier contacts suitable for self-aligned gate fabrication of GaAs MESFETs. Thermal stability of electrical and physical characteristics has been studied following furnace annealing and rapid thermal processing of contacts with compositions near Ta/sub 5/Si/sub 3/ (x = 0.6). Assessment of integrity of the annealed contacts has been made based on measurement of electrical characteristics, interface interdiffusion, and evaporation of GaAs through the contact. Superior stability as a function of anneal temperature up to 900/sup 0/C was achieved for TaSi/sub 0.6/ contacts using rapid thermal processing (RTP) techniques rather than furnace annealing. Current-voltage characteristics were found to be insensitive to RTP temperature between 700 and 900/sup 0/C.

  19. Growth of high-quality GaAs on Ge/Si{sub 1-x}Ge{sub x} on nanostructured silicon substrates

    SciTech Connect (OSTI)

    Vanamu, G.; Datye, A.K.; Dawson, R.; Zaidi, Saleem H. [Department of Chemical and Nuclear Engineering, University of New Mexico, Albuquerque, New Mexico 87131 (United States) and Center for Micro-Engineered Materials, University of New Mexico, Albuquerque, New Mexico 87131 (United States); Center for High Technology Materials, 1313 Goddard SE, Albuquerque, New Mexico 87106 (United States); Gratings, Inc., 2700 B Broadbent Parkway, NE, Albuquerque, New Mexico 87107 (United States)

    2006-06-19T23:59:59.000Z

    Heteroepitaxial growth of GaAs/Ge/SiGe films on submicrostructured Si substrates is reported. One-dimensional, nanometer-linewidth, submicrometer period features were fabricated in Si substrates using interferometric lithography, reactive ion etching, and wet-chemical etching techniques. The quality of the GaAs layers grown on these structures was investigated using high-resolution x-ray diffraction, transmission electron microscopy, scanning electron microscopy, photoluminescence, and etch pit density measurements. The defect density of GaAs epilayers grown on submicrostructured Si at {approx}6x10{sup 5} cm{sup -2} was two orders of magnitude lower compared with that grown on planar silicon. The optical quality of the GaAs/Ge/SiGe on submicrostructured Si was comparable to that of single crystal GaAs.

  20. Multi-junction, monolithic solar cell using low-band-gap materials lattice matched to GaAs or Ge

    DOE Patents [OSTI]

    Olson, Jerry M. (Lakewood, CO); Kurtz, Sarah R. (Golden, CO); Friedman, Daniel J. (Lakewood, CO)

    2001-01-01T23:59:59.000Z

    A multi-junction, monolithic, photovoltaic solar cell device is provided for converting solar radiation to photocurrent and photovoltage with improved efficiency. The solar cell device comprises a plurality of semiconductor cells, i.e., active p/n junctions, connected in tandem and deposited on a substrate fabricated from GaAs or Ge. To increase efficiency, each semiconductor cell is fabricated from a crystalline material with a lattice constant substantially equivalent to the lattice constant of the substrate material. Additionally, the semiconductor cells are selected with appropriate band gaps to efficiently create photovoltage from a larger portion of the solar spectrum. In this regard, one semiconductor cell in each embodiment of the solar cell device has a band gap between that of Ge and GaAs. To achieve desired band gaps and lattice constants, the semiconductor cells may be fabricated from a number of materials including Ge, GaInP, GaAs, GaInAsP, GaInAsN, GaAsGe, BGaInAs, (GaAs)Ge, CuInSSe, CuAsSSe, and GaInAsNP. To further increase efficiency, the thickness of each semiconductor cell is controlled to match the photocurrent generated in each cell. To facilitate photocurrent flow, a plurality of tunnel junctions of low-resistivity material are included between each adjacent semiconductor cell. The conductivity or direction of photocurrent in the solar cell device may be selected by controlling the specific p-type or n-type characteristics for each active junction.

  1. Impact of heavy hole-light hole coupling on optical selection rules in GaAs quantum dots

    SciTech Connect (OSTI)

    Belhadj, T.; Amand, T.; Kunz, S.; Marie, X.; Urbaszek, B. [INSA-CNRS-UPS, LPCNO, Universite de Toulouse, 135 Av. Rangueil, 31077 Toulouse (France); Kunold, A. [INSA-CNRS-UPS, LPCNO, Universite de Toulouse, 135 Av. Rangueil, 31077 Toulouse (France); Departamento de Ciencias Basicas, UAM-A, Col. Reynosa Tamaulipas, 02200 Mexico D.F. (Mexico); Simon, C.-M. [INSA-CNRS-UPS, LPCNO, Universite de Toulouse, 135 Av. Rangueil, 31077 Toulouse (France); CNRS-UPS, LCAR, IRSAMC, Universite de Toulouse, 31062 Toulouse (France); Kuroda, T.; Abbarchi, M.; Mano, T.; Sakoda, K. [National Institute for Material Science, Namiki 1-1, Tsukuba 305-0044 (Japan)

    2010-08-02T23:59:59.000Z

    We report strong heavy hole-light hole mixing in GaAs quantum dots grown by droplet epitaxy. Using the neutral and charged exciton emission as a monitor we observe the direct consequence of quantum dot symmetry reduction in this strain free system. By fitting the polar diagram of the emission with simple analytical expressions obtained from k{center_dot}p theory we are able to extract the mixing that arises from the heavy-light hole coupling due to the geometrical asymmetry of the quantum dot.

  2. Below gap optical absorption in GaAs driven by intense, single-cycle coherent transition radiation

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Goodfellow, J.; Fuchs, M.; Daranciang, D.; Ghimire, S.; Chen, F.; Loos, H.; Reis, D. A.; Fisher, A. S.; Lindenberg, A. M.

    2014-01-01T23:59:59.000Z

    Single-cycle terahertz fields generated by coherent transition radiation from a relativistic electron beam are used to study the high field optical response of single crystal GaAs. Large amplitude changes in the sub-band-gap optical absorption are induced and probed dynamically by measuring the absorption of a broad-band optical beam generated by transition radiation from the same electron bunch, providing an absolutely synchronized pump and probe geometry. This modification of the optical properties is consistent with strong-field-induced electroabsorption. These processes are pertinent to a wide range of nonlinear terahertz-driven light-matter interactions anticipated at accelerator-based sources.

  3. Influence of GaAs surface termination on GaSb/GaAs quantum dot structure and band offsets

    SciTech Connect (OSTI)

    Zech, E. S.; Chang, A. S.; Martin, A. J.; Canniff, J. C.; Millunchick, J. M. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States)] [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Lin, Y. H. [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States)] [Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Goldman, R. S. [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States) [Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States); Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-2136 (United States)

    2013-08-19T23:59:59.000Z

    We have investigated the influence of GaAs surface termination on the nanoscale structure and band offsets of GaSb/GaAs quantum dots (QDs) grown by molecular-beam epitaxy. Transmission electron microscopy reveals both coherent and semi-coherent clusters, as well as misfit dislocations, independent of surface termination. Cross-sectional scanning tunneling microscopy and spectroscopy reveal clustered GaSb QDs with type I band offsets at the GaSb/GaAs interfaces. We discuss the relative influences of strain and QD clustering on the band offsets at GaSb/GaAs interfaces.

  4. The Influence of High-Energy Lithium Ion Irradiation on Electrical Characteristics of Silicon and GaAs Solar Cells

    E-Print Network [OSTI]

    B. Jayashree; Ramani; M. C. Radhakrishna; Anil Agrawal; Saif Ahmad Khan; A. Meulenberg

    2006-10-22T23:59:59.000Z

    Space-grade Si and GaAs solar cells were irradiated with 15 & 40 MeV Li ions. Illuminated (AM0 condition) and unilluminated I-V curves reveal that the effect of high-energy Li ion irradiation has produced similar effects to that of proton irradiation. However, an additional, and different, defect mechanism is suggested to dominate in the heavier-ion results. Comparison is made with proton-irradiated solar-cell work and with non-ionizing energy-loss (NIEL) radiation-damage models.

  5. Novel Metal-Sulfur-Based Air-Stable Passivation of GaAs with Very Low Surface State Densities

    SciTech Connect (OSTI)

    Ashby, Carol I.H.; Baca, Albert G.; Chang, P.-C; Hafich, M.J.; Hammons, B.E.; Zavadil, Kevin R.

    1999-08-09T23:59:59.000Z

    A new air-stable electronic surface passivation for GaAs and other III-V compound semiconductors that employs sulfur and a suitable metal ion, e.g., Zn, and that is robust towards plasma dielectric deposition has been developed. Initial improvements in photoluminescence are twice that of S-only treatments and have been preserved for >11 months with SiO{sub x}N{sub y} dielectric encapsulation. Photoluminescence and X-ray photoelectron spectroscopies indicate that the passivation consists of two major components with one being stable for >2 years in air. This process improves heterojunction bipolar transistor current gain for both large and small area devices.

  6. Nucleation, transition, and maturing of the self-assembled Au droplets on various type-A GaAs substrates

    SciTech Connect (OSTI)

    Li, Ming-Yu, E-mail: mingyuli.oliver@gmail.com; Sui, Mao; Kim, Eun-Soo [College of Electronics and Information, Kwangwoon University, Nowon-gu, Seoul 139-701 (Korea, Republic of); Lee, Jihoon, E-mail: jihoonleenano@gmail.com [College of Electronics and Information, Kwangwoon University, Nowon-gu, Seoul 139-701 (Korea, Republic of); Institute of Nanoscale Science and Engineering, University of Arkansas, Fayetteville, Arkansas 72701 (United States)

    2014-08-28T23:59:59.000Z

    In this study, the fabrication of self-assembled Au droplets is successfully demonstrated on various type-A GaAs substrates: (711)A, (511)A, (411)A, and (311)A. The nucleation of the self-assembled tiny Au clusters is observed at 300?°C. As an intermediate stage, corrugated Au nanostructures are clearly observed at 350?°C on various type-A GaAs surfaces, rarely witnessed on other substrates. Based on the Volmer-Weber growth mode, the dome-shaped Au droplets with excellent uniformities are successfully fabricated between 500 and 550?°C. As a function of annealing temperature, the self-assembled Au droplets show the increased dimensions including average height and diameter, compensated by the decreased average density. Depending on the substrate indices utilized, the size and density of Au droplets show clear differences throughout the whole temperature range. The results are symmetrically analyzed by using atomic force microscope images, cross-sectional line-profiles, size and density plots, height distribution histograms, and Fourier filter transform power spectra.

  7. High-field electroluminescence in semiconductor tunnel junctions with a Mn-doped GaAs layer

    SciTech Connect (OSTI)

    Hai, Pham Nam [Department of Electrical Engineering and Information Systems, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan); Department of Physical Electronics, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-0033 (Japan); Yatsui, Takashi; Ohtsu, Motoichi; Tanaka, Masaaki [Department of Electrical Engineering and Information Systems, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan); Nanophotonics Research Center, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)

    2014-09-21T23:59:59.000Z

    We investigated high-field electroluminescence (EL) in semiconductor tunnel junctions with a Mn-doped GaAs layer (here, referred to as GaAs:Mn). Besides the band-gap emission of GaAs, the EL spectra show visible light emissions with two peaks at 1.94?eV and 2.19?eV, which are caused by d-d transitions of the Mn atoms excited by hot electrons. The threshold voltages for band-gap and visible light EL in the tunnel junctions with a GaAs:Mn electrode are 1.3?V higher than those of GaAs:Mn excited by hot holes in reserve biased p{sup +}-n junctions, which is consistent with the hot carrier transport in the band profiles of these structures. Our EL results at room temperature show that the electron temperature in GaAs:Mn can be as high as ?700?K for a low input electrical power density of 0.4?W/cm{sup 2}, while the lattice temperature of the GaAs:Mn layer can be kept at 340?K.

  8. Electrical Bias as an Alternate Method for Reproducible Measurement of Copper Indium Gallium Diselenide (CIGS) Photovoltaic Modules: Preprint

    SciTech Connect (OSTI)

    Deline, C.; Stokes, A.; Silverman, T. J.; Rummel, S.; Jordan, D.; Kurtz, S.

    2012-08-01T23:59:59.000Z

    Light-to-dark metastable changes in thin-film photovoltaic (PV) modules can introduce uncertainty when measuring module performance on indoor flash testing equipment. This study describes a method to stabilize module performance through forward-bias current injection rather than light exposure. Measurements of five pairs of thin-film copper indium gallium diselenide (CIGS) PV modules indicate that forward-bias exposure maintained the PV modules at a stable condition (within 1%) while the unbiased modules degraded in performance by up to 12%. It was additionally found that modules exposed to forward bias exhibited stable performance within about 3% of their long-term outdoor exposed performance. This carrier-injection method provides a way to reduce uncertainty arising from fast transients in thin-film module performance between the time a module is removed from light exposure and when it is measured indoors, effectively simulating continuous light exposure by injecting minority carriers that behave much as photocarriers do. This investigation also provides insight into the initial light-induced transients of thin-film modules upon outdoor deployment.

  9. Photon self-induced spin-to-orbital conversion in a terbium-gallium-garnet crystal at high laser power

    SciTech Connect (OSTI)

    Mosca, S.; De Rosa, R.; Milano, L. [Dipartimento di Scienze Fisiche, Universita di Napoli 'Federico II', Complesso Universitario di Monte S. Angelo, 80126 Napoli (Italy); INFN Sezione di Napoli, Complesso Universitario di Monte S. Angelo, 80126 Napoli (Italy); Canuel, B.; Genin, E. [EGO, European Gravitational Observatory, Via E. Amaldi, 56021 S. Stefano a Macerata, Cascina (Italy); Karimi, E. [Dipartimento di Scienze Fisiche, Universita di Napoli 'Federico II', Complesso Universitario di Monte S. Angelo, 80126 Napoli (Italy); Piccirillo, B.; Santamato, E. [Dipartimento di Scienze Fisiche, Universita di Napoli 'Federico II', Complesso Universitario di Monte S. Angelo, 80126 Napoli (Italy); CNISM-Consorzio Nazionale Interuniversitario per le Scienze Fisiche della Materia, Napoli (Italy); Marrucci, L. [Dipartimento di Scienze Fisiche, Universita di Napoli 'Federico II', Complesso Universitario di Monte S. Angelo, 80126 Napoli (Italy); CNR-INFM Coherentia, Complesso Universitario di Monte S. Angelo, 80126 Napoli (Italy)

    2010-10-15T23:59:59.000Z

    In this paper, we present experimental evidence of a third-order nonlinear optical process, self-induced spin-to-orbital conversion (SISTOC) of the photon angular momentum. This effect is the physical mechanism at the origin of the depolarization of very intense laser beams propagating in isotropic materials. The SISTOC process, like self-focusing, is triggered by laser heating leading to a radial temperature gradient in the medium. In this work we tested the occurrence of SISTOC in a terbium-gallium-garnet rod for an impinging laser power of about 100 W. To study the SISTOC process we used different techniques: polarization analysis, interferometry, and tomography of the photon orbital angular momentum. Our results confirm, in particular, that the apparent depolarization of the beam is due to the occurrence of maximal entanglement between the spin and orbital angular momentum of the photons undergoing the SISTOC process. This explanation of the true nature of the depolarization mechanism could be of some help in finding novel methods to reduce or to compensate for this usually unwanted depolarization effect in all cases where very high laser power and good beam quality are required.

  10. Saddle-like deformation in a dielectric elastomer actuator embedded with liquid-phase gallium-indium electrodes

    SciTech Connect (OSTI)

    Wissman, J., E-mail: jwissman@andrew.cmu.edu [Department of Mechanical Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 (United States); Finkenauer, L. [Department of Mechanical Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 (United States); Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 (United States); Deseri, L. [DICAM, Department of Mechanical, Civil and Environmental Engineering, University of Trento, via Mesiano 77 38123 Trento (Italy); TMHRI-Department of Nanomedicine, The Methodist Hospital Research Institute, 6565 Fannin St., MS B-490 Houston, Texas 77030 (United States); Mechanics, Materials and Computing Center, CEE and ME-CIT, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 (United States); Majidi, C. [Department of Mechanical Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 (United States); Robotics Institute and Department of Civil and Environmental Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 (United States)

    2014-10-14T23:59:59.000Z

    We introduce a dielectric elastomer actuator (DEA) composed of liquid-phase Gallium-Indium (GaIn) alloy electrodes embedded between layers of poly(dimethylsiloxane) (PDMS) and examine its mechanics using a specialized elastic shell theory. Residual stresses in the dielectric and sealing layers of PDMS cause the DEA to deform into a saddle-like geometry (Gaussian curvature K<0). Applying voltage ? to the liquid metal electrodes induces electrostatic pressure (Maxwell stress) on the dielectric and relieves some of the residual stress. This reduces the longitudinal bending curvature and corresponding angle of deflection ?. Treating the elastomer as an incompressible, isotropic, NeoHookean solid, we develop a theory based on the principle of minimum potential energy to predict the principal curvatures as a function of ?. Based on this theory, we predict a dependency of ? on ? that is in strong agreement with experimental measurements performed on a GaIn-PDMS composite. By accurately modeling electromechanical coupling in a soft-matter DEA, this theory can inform improvements in design and fabrication.

  11. Self-cleaning and surface recovery with arsine pretreatment in ex situ atomic-layer-deposition of Al2O3 on GaAs

    E-Print Network [OSTI]

    /Thomas Swan close-coupled showerhead cold-wall MOCVD system. The buffer epilayers of GaAs were grown on 2 in for these interfaces. In addition, when designing an in situ MOCVD process, the typical TMA/H2O is incompatible

  12. Synthesis of GaNxAs1-x thin films by pulsed laser melting and rapid thermal annealing (PLM-RTA) of N+-implanted GaAs

    E-Print Network [OSTI]

    2003-01-01T23:59:59.000Z

    energy (eV) Fig. 7 N impl. GaAs PLM+950 o C 10s bamd gap, Eand Rapid Thermal Annealing (PLM-RTA) of N + -implanted GaAsof N (x imp ) and processed by PLM at an energy fluence of

  13. ELSEWER Journal of Magnetism and Magnetic Materials 169 (1997) 261-270 Superparamagnetic behavior of Fe,GaAs precipitates in GaAs

    E-Print Network [OSTI]

    Woodall, Jerry M.

    ELSEWER Journal of Magnetism and Magnetic Materials 169 (1997) 261-270 Superparamagnetic behavior; revised 6 December 1996 Abstract We present magnetization measurements on Fe3GaAs clusters distributed-dependent magnetization well above the blocking temperature indicate a particle size distribution in agreement

  14. Relaxed, high-quality InP on GaAs by using InGaAs and InGaP graded buffers to avoid phase separation

    E-Print Network [OSTI]

    Relaxed, high-quality InP on GaAs by using InGaAs and InGaP graded buffers to avoid phaseAs was 70% of that on bulk InP at both temperatures. To achieve this, graded buffers in the InGaAs, InGaP

  15. Growth, microstructure, and luminescent properties of direct-bandgap InAlP on relaxed InGaAs on GaAs substrates

    E-Print Network [OSTI]

    an impact on the luminescence spectrum. While similar to InGaP in many ways, the greater tendency for phase as the InGaP system, but still has desirable properties. In0.48Al0.52P is lattice- matched to GaAs and has

  16. Compositionally-graded InGaAsInGaP alloys and GaAsSb alloys for metamorphic InP on GaAs

    E-Print Network [OSTI]

    Compositionally-graded InGaAs­InGaP alloys and GaAsSb alloys for metamorphic InP on GaAs Li Yang a of tandem graded layers of InGaAs and InGaP with compositional grading of the In concentration. This tandem

  17. Point contact Andreev spectroscopy of epitaxial Co{sub 2}FeSi Heusler alloys on GaAs (001)

    SciTech Connect (OSTI)

    Lehmann, Hauke; Merkt, Ulrich; Meier, Guido [Institut fuer Angewandte Physik und Zentrum fuer Mikrostrukturforschung, Universitaet Hamburg, Jungiusstrasse 11, 20355 Hamburg (Germany); Scholtyssek, Jan M. [Institut fuer Angewandte Physik und Zentrum fuer Mikrostrukturforschung, Universitaet Hamburg, Jungiusstrasse 11, 20355 Hamburg (Germany); Institut fuer Elektrische Messtechnik und Grundlagen der Elektrotechnik, Technische Universitaet Braunschweig, Hans-Sommer-Strasse 66, 38106 Braunschweig (Germany); Herrmann, Claudia; Herfort, Jens [Paul-Drude-Institut fuer Festkoerperelektronik, Hausvogteiplatz 5-7, 10117 Berlin (Germany)

    2011-09-15T23:59:59.000Z

    The predicted half-metallicity of Co{sub 2}FeSi in combination with its high Curie temperature of above 980 K makes this Heusler alloy interesting for spinelectronics. Thin Co{sub 2}FeSi films are grown by molecular-beam epitaxy on GaAs (001) with a close lattice match. We present a study of point-contact measurements on different films, varying in thickness between 18 nm and 48 nm and in substrate temperature during deposition between 100 deg. C and 300 deg. C. Transport spin polarizations at the Fermi level are determined from differential conductance curves obtained by point-contact Andreev-reflection spectroscopy. A maximum transport spin polarization of about 60% is measured for a 18 nm thin Co{sub 2}FeSi film grown at 200 deg. C.

  18. Electron Transport Behavior on Gate Length Scaling in Sub-50 nm GaAs Metal Semiconductor Field Effect Transistors

    SciTech Connect (OSTI)

    Han, Jaeheon [Department of Electronic Engineering, Kangnam University, 111 Gugal-dong, Giheung-gu, Yongin-city, Gyeonggi-do, Korea 446-702 (Korea, Republic of)

    2011-12-23T23:59:59.000Z

    Short channel GaAs Metal Semiconductor Field Effect Transistors (MESFETs) have been fabricated with gate length to 20 nm, in order to examine the characteristics of sub-50 nm MESFET scaling. Here the rise in the measured transconductance is mainly attributed to electron velocity overshoot. For gate lengths below 40 nm, however, the transconductance drops suddenly. The behavior of velocity overshoot and its degradation is investigated and simulated by using a transport model based on the retarded Langevin equation (RLE). This indicates the existence of a minimum acceleration length needed for the carriers to reach the overshoot velocity. The argument shows that the source resistance must be included as an internal element, or appropriate boundary condition, of relative importance in any model where the gate length is comparable to the inelastic mean free path of the carriers.

  19. Magnetic anisotropies in epitaxial Fe{sub 3}O{sub 4}/GaAs(100) patterned structures

    SciTech Connect (OSTI)

    Zhang, W., E-mail: xiaotur@gmail.com; Zhang, D.; Yuan, S. J.; Huang, Z. C.; Zhai, Y. [Department of Physics, Southeast University, Nanjing 211189 (China); Wong, P. K. J. [NanoElectronics Group, MESA Institute for Nanotechnology, University of Twente, P. O. Box 217, 7500 AE Enschede (Netherlands); Department of Chemistry, National University of Singapore, 3 Science Drive 3, 117543 (Singapore); Wu, J. [Department of Physics, University of York, York YO10 5DD (United Kingdom); Xu, Y. B. [Spintronics and Nanodevice Laboratory, Department of Electronics, University of York, York, YO10 5DD (United Kingdom)

    2014-10-15T23:59:59.000Z

    Previous studies on epitaxial Fe{sub 3}O{sub 4} rings in the context of spin-transfer torque effect have revealed complicated and undesirable domain structures, attributed to the intrinsic fourfold magnetocrystalline anisotropy in the ferrite. In this Letter, we report a viable solution to this problem, utilizing a 6-nm-thick epitaxial Fe{sub 3}O{sub 4} thin film on GaAs(100), where the fourfold magnetocrystalline anisotropy is negligible. We demonstrate that in the Fe{sub 3}O{sub 4} planar wires patterned from our thin film, such a unique magnetic anisotropy system has been preserved, and relatively simple magnetic domain configurations compared to those previous reports can be obtained.

  20. Molecular Beam Epitaxial Growth of Bi2Te3 and Sb2Te3 Topological Insulators on GaAs (111) Substrates: A Potential Route to Fabricate Topological Insulator p-n Junction

    E-Print Network [OSTI]

    Zhaoquan Zeng; Timothy A. Morgan; Dongsheng Fan; Chen Li; Yusuke Hirono; Xian Hu; Yanfei Zhao; Joon Sue Lee; Zhiming M. Wang; Jian Wang; Shuiqing Yu; Michael E. Hawkridge; Mourad Benamara; Gregory J. Salamo

    2013-03-11T23:59:59.000Z

    High quality Bi2Te3 and Sb2Te3 topological insulators films were epitaxially grown on GaAs (111) substrate using solid source molecular beam epitaxy. Their growth and behavior on both vicinal and non-vicinal GaAs (111) substrates were investigated by reflection high-energy electron diffraction, atomic force microscopy, x-ray diffraction, and high resolution transmission electron microscopy. It is found that non-vicinal GaAs (111) substrate is better than a vicinal substrate to provide high quality Bi2Te3 and Sb2Te3 films. Hall and magnetoresistance measurements indicate that p type Sb2Te3 and n type Bi2Te3 topological insulator films can be directly grown on a GaAs (111) substrate, which may pave a way to fabricate topological insulator p-n junction on the same substrate, compatible with the fabrication process of present semiconductor optoelectronic devices.

  1. Low dimensional GaAs/air vertical microcavity lasers

    SciTech Connect (OSTI)

    Gessler, J.; Steinl, T.; Fischer, J.; Höfling, S.; Schneider, C.; Kamp, M. [Technische Physik, Physikalisches Institut and Wilhelm Conrad Röntgen-Research Center for Complex Material Systems, Universität Würzburg, Am Hubland, D-97074 Würzburg (Germany); Mika, A.; S?k, G.; Misiewicz, J. [Institute of Physics, Wroclaw University of Technology, Wybrze?e Wyspia?skiego 27, 50-370 Wroc?aw (Poland)

    2014-02-24T23:59:59.000Z

    We report on the fabrication of gallium arsenide (GaAs)/air distributed Bragg reflector microresonators with indium gallium arsenide quantum wells. The structures are studied via momentum resolved photoluminescence spectroscopy which allows us to investigate a pronounced optical mode quantization of the photonic dispersion. We can extract a length parameter from these quantized states whose upper limit can be connected to the lateral physical extension of the microcavity via analytical calculations. Laser emission from our microcavity under optical pumping is observed in power dependent investigations.

  2. Impact of artificial lateral quantum confinement on exciton-spin relaxation in a two-dimensional GaAs electronic system

    SciTech Connect (OSTI)

    Kiba, Takayuki, E-mail: tkiba@ist.hokudai.ac.jp; Murayama, Akihiro [Graduate School of Information Science and Technology, Hokkaido University, Kita 14, Nishi 9, Kita-ku, Sapporo (Japan); CREST Japan Science and Technology Agency, 5 Sanbancho, Chiyoda-ku, Tokyo (Japan); Tanaka, Toru [Graduate School of Information Science and Technology, Hokkaido University, Kita 14, Nishi 9, Kita-ku, Sapporo (Japan); Tamura, Yosuke [Institute of Fluid Science, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai (Japan); Higo, Akio [WPI-AIMR, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai (Japan); Thomas, Cedric [Institute of Fluid Science, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai (Japan); CREST Japan Science and Technology Agency, 5 Sanbancho, Chiyoda-ku, Tokyo (Japan); Samukawa, Seiji [Institute of Fluid Science, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai (Japan); WPI-AIMR, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai (Japan); CREST Japan Science and Technology Agency, 5 Sanbancho, Chiyoda-ku, Tokyo (Japan)

    2014-10-15T23:59:59.000Z

    We demonstrate the effect of artificial lateral quantum confinement on exciton-spin relaxation in a GaAs electronic system. GaAs nanodisks (NDs) were fabricated from a quantum well (QW) by top-down nanotechnology using neutral-beam etching aided by protein-engineered bio-nano-templates. The exciton-spin relaxation time was 1.4 ns due to ND formation, significantly extended compared to 0.44 ns for the original QW, which is attributed to weakening of the hole-state mixing in addition to freezing of the carrier momentum. The temperature dependence of the spin-relaxation time depends on the ND thickness, reflecting the degree of quantum confinement.

  3. Preliminary materials assessment for the Satellite Power System (SPS)

    SciTech Connect (OSTI)

    Teeter, R.R.; Jamieson, W.M.

    1980-01-01T23:59:59.000Z

    Presently, there are two SPS reference design concepts (one using silicon solar cells; the other using gallium arsenide solar cells). A materials assessment of both systems was performed based on the materials lists set forth in the DOE/NASA SPS Reference System Report: Concept Development and Evaluation Program. This listing identified 22 materials (plus miscellaneous and organics) used in the SPS. Tracing the production processes for these 22 materials, a total demand for over 20 different bulk materials (copper, silicon, sulfuric acid, etc.) and nealy 30 raw materials (copper ore, sand, sulfur ore, etc.) was revealed. Assessment of these SPS material requirements produced a number of potential material supply problems. The more serious problems are those associated with the solar cell materials (gallium, gallium arsenide, sapphire, and solar grade silicon), and the graphite fiber required for the satellite structure and space construction facilities. In general, the gallium arsenide SPS option exhibits more serious problems than the silicon option, possibly because gallium arsenide technology is not as well developed as that for silicon. Results are presented and discussed in detail. (WHK)

  4. Comparison of luminescent efficiency of InGaAs quantum well structures grown on Si, GaAs, Ge, and SiGe virtual substrate

    E-Print Network [OSTI]

    , and SiGe virtual substrate V. K. Yang, S. M. Ting, M. E. Groenert, M. T. Bulsara, M. T. Currie, C. W efficiency of InGaAs quantum wells on Si via SiGe interlayers, identical In0.2Ga0.8As quantum well structures metalorganic vapor deposition system. The substrates used include GaAs, Si, Ge, and SiGe virtual substrates

  5. Room-temperature cw operation of InGaAsP/InGaP lasers at 727 nm grown on GaAs substrates by liquid phase epitaxy

    SciTech Connect (OSTI)

    Wakao, K.; Nishi, H.; Kusunoki, T.; Isozumi, S.; Ohsaka, S.

    1984-06-01T23:59:59.000Z

    InGaAsP/InGaP lasers emitting at 724--727 nm have been fabricated on GaAs substrates using liquid phase epitaxy. The threshold current is reduced to 8 kA/cm/sup 2/ by thinning the active layer. Room-temperature cw operation is achieved for the first time in the lasing wavelength range below 760 nm in this quaternary system.

  6. Passivation of carbon acceptors during growth of carbon-doped GaAs, InGaAs, and HBTs by MOCVD

    SciTech Connect (OSTI)

    Stockman, S.A.; Hanson, A.W.; Lichtenthal, S.M.; Fresina, M.T.; Hoefler, G.E.; Hsieh, K.C.; Stillman, G.E. (Univ. of Illinois, Urbana (United States))

    1992-12-01T23:59:59.000Z

    Carbon doped p-type GaAs and In[sub 0.53]Ga[sub 0.47]As epitaxial layers were grown by low-pressure metalorganic chemical vapor deposition using CCl[sub 4] as the carbon source. Low-temperature post-growth annealing resulted in a significant increase in the hole concentration for both GaAs and In[sub 0.53]Ga[sub 0.47]As, especially at high doping levels. The most heavily doped GaAs sample had a hole concentration of 3.6 [times] 10[sup 20] cm[sup [minus]3] after a 5 minute anneal at approximately 400[degree]C in N[sub 2], while the hole concentration in In[sub 0.53]Ga[sub 0.47]As reached 1.6 [times] 10[sup 19] cm[sup [minus]3] after annealing. This behavior is attributed to hydrogen passivation of carbon acceptors. Post-growth cool-down in an AsH[sub 3]/H[sub 2] ambient was found to be the most important factor affecting the degree of passivation for single, uncapped GaAs layers. No evidence of passivation is observed in the base region of InGaP/GaAs HBTs grown at approximately 625[degree]C. The effect of n-type cap layers and cool-down sequence on passivation of C-doped InGaAs grown at approximately 525[degree] shows that hydrogen can come from AsH[sub 3], PH[sub 3], or H[sub 2], and can be incorporated during growth and post-growth cool-down. In the case of InP/InGaAs HBTs, significant passivation was found to occur in the C-doped base region. 28 refs., 5 figs., 2 tabs.

  7. Metal-insulator-semiconductor structure on low-temperature grown GaAs M. Young, W. Li, and T. P. Ma

    E-Print Network [OSTI]

    Woodall, Jerry M.

    technique has been used to deposit high-quality insula- tors on Si,16 GaN,17 and GaP.18 It utilizes a high-speed jet of light carrier gases to transport depositing species onto the substrate to form insulator films-type substrate was chosen for potential n-channel de- vices. A 400 nm thick regular p-type GaAs epilayer doped

  8. A 77 GHz Transceiver for Automotive Radar System Using a120nm In AlAs/In GaAs Metamorphic HEMTs

    E-Print Network [OSTI]

    Kwon, Youngwoo

    A 77 GHz Transceiver for Automotive Radar System Using a120nm 0.4 0.35 In AlAs/In GaAs Metamorphic-mail:ykwon@snu.ac.kr) Abstract -- In this work, we demonstrate a compact 77GHz single-chip transceiver for an automotive radar at the transmitter and a 5dB conversion gain at the receiver. Index Terms -- Automotive radar, 77GHz, MHEMT, MMIC

  9. Discrimination between energy transfer and back transfer processes for GaAs host and Er luminescent dopants using electric response analysis

    SciTech Connect (OSTI)

    Ishii, Masashi, E-mail: ISHII.Masashi@nims.go.jp [National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0047 (Japan); Koizumi, Atsushi; Fujiwara, Yasufumi [Division of Materials and Manufacturing Science, Graduate School of Engineering Osaka University, Suita, Osaka 565-0871 (Japan); Takeda, Yoshikazu [Nagoya Industrial Science Research Institute, Nagoya, Aichi 464-0819 (Japan)

    2014-04-07T23:59:59.000Z

    The energy transfer and back transfer processes of GaAs co-doped with Er and O (GaAs:Er,O) were experimentally distinguished by using a frequency response analysis of the AC photocurrent. The results were achieved by using the difference in the frequency dispersion between (1) the dispersion of the energy transfer, which is triggered by the trapping of free charges in the GaAs host and is represented with the Debye relaxation response and (2) the dispersion of the energy back transfer, which is induced by non-radiative transition of 4f bound electrons in the Er dopants and is described with a Lorentzian. The Debye relaxation response found in GaAs:Er,O provided a charge trapping time that was dependent on temperature, which was well correlated with the thermal quenching property of intense intra-4f-shell luminescence. The spectral shape of the Lorentzian dependence on the temperature was explained with the thermal excitation of Er 4f electrons and release of trapped charges in GaAs. The thermal excitation and release of charges consistently explained the characteristics of weak 4f luminescence in low- and high-temperature regions, respectively.

  10. Rare-earth metal gallium silicides via the gallium self-flux method. Synthesis, crystal structures, and magnetic properties of RE(Ga1–xSix)? (RE=Y, La–Nd, Sm, Gd–Yb, Lu)

    SciTech Connect (OSTI)

    Darone, Gregory M.; Hmiel, Benjamin; Zhang, Jiliang [Department of Chemistry and Biochemistry, University of Delaware, Newark, Delaware 19716 (United States); Saha, Shanta; Kirshenbaum, Kevin; Greene, Richard; Paglione, Johnpierre [Department of Physics, University of Maryland, College Park, Maryland 20742 (United States); Bobev, Svilen, E-mail: bobev@udel.edu [Department of Chemistry and Biochemistry, University of Delaware, Newark, Delaware 19716 (United States)

    2013-05-01T23:59:59.000Z

    Fifteen ternary rare-earth metal gallium silicides have been synthesized using molten Ga as a molten flux. They have been structurally characterized by single-crystal and powder X-ray diffraction to form with three different structures—the early to mid-late rare-earth metals RE=La–Nd, Sm, Gd–Ho, Yb and Y form compounds with empirical formulae RE(GaxSi1–x)? (0.38?x?0.63), which crystallize with the tetragonal ?-ThSi? structure type (space group I4?/amd, No. 141; Pearson symbol tI12). The compounds of the late rare-earth crystallize with the orthorhombic ?-GdSi? structure type (space group Imma, No. 74; Pearson symbol oI12), with refined empirical formula REGaxSi2–x–y (RE=Ho, Er, Tm; 0.33?x?0.40, 0.10?y?0.18). LuGa?.?????Si?.????? crystallizes with the orthorhombic YbMn?.??Si?.?? structure type (space group Cmcm, No. 63; Pearson symbol oC24). Structural trends are reviewed and analyzed; the magnetic susceptibilities of the grown single-crystals are presented. - Graphical abstract: This article details the exploration of the RE–Ga–Si ternary system with the aim to systematically investigate the structural “boundaries” between the ?-ThSi? and ?-GdSi?-type structures, and studies of the magnetic properties of the newly synthesized single-crystalline materials. Highlights: • Light rare-earth gallium silicides crystallize in ?-ThSi? structure type. • Heavy rare-earth gallium silicides crystallize in ?-GdSi? structure type. • LuGaSi crystallizes in a defect variant of the YbMn?.??Si?.?? structure type.

  11. Alumina nanoparticle/polymer nanocomposite dielectric for flexible amorphous indium-gallium-zinc oxide thin film transistors on plastic substrate with superior stability

    SciTech Connect (OSTI)

    Lai, Hsin-Cheng [Department of Electrical Engineering, National Chung Hsing University, Taichung 40227, Taiwan (China); Pei, Zingway, E-mail: zingway@dragon.nchu.edu.tw [Department of Electrical Engineering, National Chung Hsing University, Taichung 40227, Taiwan (China); Graduate Institute of Optoelectronic Engineering, National Chung Hsing University, Taichung 40227, Taiwan (China); Center of Nanoscience and Nanotechnology, National Chung Hsing University, Taichung 40227, Taiwan (China); Jian, Jyun-Ruri; Tzeng, Bo-Jie [Graduate Institute of Optoelectronic Engineering, National Chung Hsing University, Taichung 40227, Taiwan (China)

    2014-07-21T23:59:59.000Z

    In this study, the Al{sub 2}O{sub 3} nanoparticles were incorporated into polymer as a nono-composite dielectric for used in a flexible amorphous Indium-Gallium-Zinc Oxide (a-IGZO) thin-film transistor (TFT) on a polyethylene naphthalate substrate by solution process. The process temperature was well below 100?°C. The a-IGZO TFT exhibit a mobility of 5.13?cm{sup 2}/V s on the flexible substrate. After bending at a radius of 4?mm (strain?=?1.56%) for more than 100 times, the performance of this a-IGZO TFT was nearly unchanged. In addition, the electrical characteristics are less altered after positive gate bias stress at 10?V for 1500?s. Thus, this technology is suitable for use in flexible displays.

  12. Charge and fluence lifetime measurements of a dc high voltage GaAs photogun at high average current

    SciTech Connect (OSTI)

    J. Grames, R. Suleiman, P.A. Adderley, J. Clark, J. Hansknecht, D. Machie, M. Poelker, M.L. Stutzman

    2011-04-01T23:59:59.000Z

    GaAs-based dc high voltage photoguns used at accelerators with extensive user programs must exhibit long photocathode operating lifetime. Achieving this goal represents a significant challenge for proposed high average current facilities that must operate at tens of milliamperes or more. This paper describes techniques to maintain good vacuum while delivering beam, and techniques that minimize the ill effects of ion bombardment, the dominant mechanism that reduces photocathode yield of a GaAs-based dc high voltage photogun. Experimental results presented here demonstrate enhanced lifetime at high beam currents by: (a) operating with the drive laser beam positioned away from the electrostatic center of the photocathode, (b) limiting the photocathode active area to eliminate photoemission from regions of the photocathode that do not support efficient beam delivery, (c) using a large drive laser beam to distribute ion damage over a larger area, and (d) by applying a relatively low bias voltage to the anode to repel ions created within the downstream beam line. A combination of these techniques provided the best total charge extracted lifetimes in excess of 1000 C at dc beam currents up to 9.5 mA, using green light illumination of bulk GaAs inside a 100 kV photogun.

  13. Spectroscopic ellipsometry studies of GaN films deposited by reactive rf sputtering of GaAs target

    SciTech Connect (OSTI)

    Biswas, A.; Bhattacharyya, D.; Sahoo, N. K. [Spectroscopy Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India); Yadav, Brajesh S.; Major, S. S. [Department of Physics, Indian Institute of Technology Bombay, Mumbai 400 076 (India); Srinivasa, R. S. [Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay, Mumbai 400 076 (India)

    2008-04-15T23:59:59.000Z

    GaN films have been deposited by reactive rf sputtering of GaAs target in 100% nitrogen ambient on quartz substrates at different substrate temperatures ranging from room temperature to 700 deg. C. A series of films, from arsenic-rich amorphous to nearly arsenic-free polycrystalline hexagonal GaN, has been obtained. The films have been characterized by phase modulated spectroscopic ellipsometry to obtain the optical parameters, viz., fundamental band gap, refractive index, and extinction coefficient, and to understand their dependence on composition and microstructure. A generalized optical dispersion model has been used to carry out the ellipsometric analysis for amorphous and polycrystalline GaN films and the variation of the optical parameters of the films has been studied as a function of substrate temperature. The refractive index values of polycrystalline films with preferred orientation of crystallites are slightly higher (2.2) compared to those for amorphous and randomly oriented films. The dominantly amorphous GaN film shows a band gap of 3.47 eV, which decreases to 3.37 eV for the strongly c-axis oriented polycrystalline film due to the reduction in amorphous phase content with increase in substrate temperature.

  14. Gallium interactions with Zircaloy

    E-Print Network [OSTI]

    West, Michael Keith

    1998-01-01T23:59:59.000Z

    -nitride insulated cylinder wrapped with a tantalum oven wire and provides for evaporation of solid source materials. For an appropriate combination of gas pressure, filament current, and anode voltage, a plasma is formed in the hollow cathode region of the source... of the goniometer motor above 100 'C. In addition, braided copper straps were wrapped around the goniometer motors and connected to the cold plates in the target chamber. Zirc-4 Target Heater Wire Current = 2. 5 A To Current Integrator Inner Cup Bias = -200...

  15. Gallium interactions with Zircaloy 

    E-Print Network [OSTI]

    West, Michael Keith

    1998-01-01T23:59:59.000Z

    with Rutherford backscattering and SIMS techniques. Results indicate that the Zirc-4 is little affected up to a fluency of [] Ga ions/[]. After implantation of [] Ga ions/[], sub-grain features on the order of 2 gm were observed which may be due to intermetallic...

  16. 256 NATURE PHYSICS | VOL 8 | APRIL 2012 | www.nature.com/naturephysics news & views

    E-Print Network [OSTI]

    Loss, Daniel

    resonances, such as the vibrational modes of a suspended beam. Now, Martin Gustafsson and colleagues, writing-state equivalent of ripples on a pond. In piezoelectric materials (such as the gallium arsenide slab used in a radiofrequency- tank circuit, one obtains a so-called radiofrequency SET5 -- an extremely sensitive and fast

  17. Smith chart, where the IRL of the amplifier is constant. The new chart has been added to the constant available gain and constant

    E-Print Network [OSTI]

    Yakovlev, Vadim

    of the proposed design charts has been demonstrated by the design of a narrowband monolithic low-noise amplifier. Streit, MMIC low-noise amplifiers and application above 100 GHZ, 22nd Ann Gallium Arsenide Integrated expressions for simpli- fying the design of broadband low noise microwave transistor amplifi- ers, IEEE Trans

  18. The influence of a doping profile on the characteristics of an ion-implanted GaAs field-effect transistor with a Schottky barrier

    SciTech Connect (OSTI)

    Shestakov, A. K., E-mail: shestakov@thermo.isp.nsc.ru; Zhuravlev, K. S. [Russian Academy of Sciences, Rzhanov Institute of Semiconductor Physics, Siberian Branch (Russian Federation)

    2011-12-15T23:59:59.000Z

    A GaAs field-effect ion-implanted transistor with a Schottky barrier is simulated. The doping profile obtained when doping through an insulator mask is determined and the dependences of the static transistor characteristics on the parameters of the doping profile are calculated and analyzed. The physical processes controlling the transistor characteristics in the case of a variation in the parameters of its doping profile and the coefficient of compensation of the substrate are studied. Based on calculations, the optimal doping-profile parameters ensuring the best characteristics for transistors are predicted.

  19. Optical and digital GaAs technologies for signal-processing applications; Proceedings of the Meeting, Orlando, FL, Apr. 16-18, 1990

    SciTech Connect (OSTI)

    Bendett, M.P.; Butler, D.H., Jr.; Prabhakar, A.; Yang, A.; (Honeywell, Inc., Minneapolis, MN; Booz, Allen and Hamilton, Inc., Bethesda, MD; DARPA, Arlington, VA)

    1990-01-01T23:59:59.000Z

    Practical problems that need to be solved for the introduction of optical modules into processing systems are reviewed. Some papers deal with the state of the art in such key devices as Bragg cells, spatial light modulators, and fast CCDs. Issues unique to optical packaging are also highlightened. New architectures to enable real-time operations are demonstrated, and optical interconnects for parallel processors are discussed. Particular attention is given to the status and operational advantages of government-sponsored efforts to upgrade existing military systems with digital GaAs signal processors and the state of the art in computer-aided design and advanced system architectures.

  20. Evaluation of thickness and strain of thin planar layers of InAs on GaAs(001) using spectroscopic ellipsometry

    SciTech Connect (OSTI)

    Eyink, K. G.; Szmulowicz, F.; Esposito, D.; Grazulis, L.; Hill, M.; Mahalingam, K.; Aronow, A. J. [Nano Electronic Materials Branch (RXAN), Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Ohio 45433-7707 (United States)

    2014-07-21T23:59:59.000Z

    We develop a technique for accurately measuring thickness of planar InAs films grown on (001) GaAs by spectroscopic ellipsometry, using bulk optical constants. We observe that the critical point structure for the E{sub 1} and E{sub 1}?+??{sub 1} transitions extracted from the measured dielectric properties varies with strain in the layer. Transmission electron microscopy confirms the extracted thickness and measures the residual strain based on the dislocation spacing in the film. At small thickness, the E{sub 1} critical point is seen to markedly deviate from the dependence predicted by deformation potential theory and appears to be consistent with additional quantum confinement effects.

  1. InGaAsN Solar Cells with 1.0eV Bandgap, Lattice Matched to GaAs

    SciTech Connect (OSTI)

    Allerman, A.A.; Banas, J.J.; Gee, J.M.; Hammons, B.E.; Jones, E.D.; Kurtz, S.R.

    1998-11-24T23:59:59.000Z

    The design, growth by metal-organic chemical vapor deposition, and processing of an In{sub 0.07}Ga{sub 0.93}As{sub 0.98}N{sub 0.02} solar Al, with 1.0 ev bandgap, lattice matched to GaAs is described. The hole diffusion length in annealed, n-type InGaAsN is 0.6-0.8 pm, and solar cell internal quantum efficiencies > 70% arc obwined. Optical studies indicate that defects or impurities, from InGAsN doping and nitrogen incorporation, limit solar cell performance.

  2. Localization-delocalization transition of electrons at the percolation threshold of semiconductor GaAs1–xNx alloys: The appearance of a mobility edge

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Alberi, K.; Fluegel, B.; Beaton, D. A.; Ptak, A. J.; Mascarenhas, A.

    2012-07-01T23:59:59.000Z

    Electrons in semiconductor alloys have generally been described in terms of Bloch states that evolve from constructive interference of electron waves scattering from perfectly periodic potentials, despite the loss of structural periodicity that occurs on alloying. Using the semiconductor alloy GaAs??xNx as a prototype, we demonstrate a localized to delocalized transition of the electronic states at a percolation threshold, the emergence of a mobility edge, and the onset of an abrupt perturbation to the host GaAs electronic structure, shedding light on the evolution of electronic structure in these abnormal alloys.

  3. Final Technical Progress Report: High-Efficiency Low-Cost Thin-Film GaAs Photovoltaic Module Development Program; July 14, 2010 - January 13, 2012

    SciTech Connect (OSTI)

    Mattos, L.

    2012-03-01T23:59:59.000Z

    This is the final technical progress report of the High-Efficiency Low-Cost Thin-Film GaAs Photovoltaic Module Development Program. Alta Devices has successfully completed all milestones and deliverables established as part of the NREL PV incubator program. During the 18 months of this program, Alta has proven all key processes required to commercialize its solar module product. The incubator focus was on back end process steps directed at conversion of Alta's high quality solar film into high efficiency 1-sun PV modules. This report describes all program deliverables and the work behind each accomplishment.

  4. Effects of atomic hydrogen and deuterium exposure on high polarization GaAs photocathodes M. Baylac,* P. Adderley, J. Brittian, J. Clark, T. Day, J. Grames, J. Hansknecht, M. Poelker, M. Stutzman, and A. T. Wu

    E-Print Network [OSTI]

    Paris-Sud XI, Université de

    chambers. The photocathode is formed when cesium (Cs) and nitrogen trifluoride (NF3) gas are applied cleaning remains an effective technique to remove surface contamination from bulk GaAs. A note- worthy. This statement stems from the realization, made over the course of years, that contamination is introduced onto

  5. Indium and gallium oxynitrides prepared in the presence of Zn{sup 2+} by ammonolysis of the oxide precursors obtained via the citrate route

    SciTech Connect (OSTI)

    Miyaake, Azumi; Masubuchi, Yuji; Takeda, Takashi [Graduate School of Engineering, Hokkaido University, N13W8, Kita-ku, Sapporo 060-8628 (Japan)] [Graduate School of Engineering, Hokkaido University, N13W8, Kita-ku, Sapporo 060-8628 (Japan); Kikkawa, Shinichi, E-mail: kikkawa@eng.hokudai.ac.jp [Graduate School of Engineering, Hokkaido University, N13W8, Kita-ku, Sapporo 060-8628 (Japan)] [Graduate School of Engineering, Hokkaido University, N13W8, Kita-ku, Sapporo 060-8628 (Japan)

    2010-04-15T23:59:59.000Z

    Ammonia nitridation of indium and gallium oxide precursors obtained through a soft solution route led to their oxynitrides [In{sub 0.97}{open_square}{sub 0.03}][N{sub 0.92}O{sub 0.08}] at 660 {sup o}C and [Ga{sub 0.89}{open_square}{sub 0.11}][N{sub 0.66}O{sub 0.34}] at 850 {sup o}C, respectively, where {open_square} refers to a In or Ga vacancy. Cation vacancies in their wurtzite-type lattice were eliminated in similar preparations with the co-presence of Zn{sup 2+} by forming complete solid solutions of (InN){sub 1-x}(ZnO){sub x} and (GaN){sub 1-y}(ZnO){sub y}. The optical absorption edge shape was found to be relatively steep at the solid solution limits of x {approx} 0.23 and y {approx} 0.33 compared to the case without zinc.

  6. A combined kick-out and dissociative diffusion mechanism of grown-in Be in InGaAs and InGaAsP. A new finite difference-Bairstow method for solution of the diffusion equations

    SciTech Connect (OSTI)

    Koumetz, Serge D., E-mail: Serge.Koumetz@univ-rouen.fr; Martin, Patrick; Murray, Hugues [Normandie Université-Université de Rouen-ENSICAEN-UMR 6508 LaMIPS, Laboratoire commun CNRS-NXP-PRESTO-ENSICAEN-UCBN 2, rue de la Girafe BP 5120, F-14079 Caen (France)

    2014-09-14T23:59:59.000Z

    Experimental results on the diffusion of grown-in beryllium (Be) in indium gallium arsenide (In{sub 0.53}Ga{sub 0.47}As) and indium gallium arsenide phosphide (In{sub 0.73}Ga{sub 0.27}As{sub 0.58}P{sub 0.42}) gas source molecular beam epitaxy alloys lattice-matched to indium phosphide (InP) can be successfully explained in terms of a combined kick-out and dissociative diffusion mechanism, involving neutral Be interstitials (Be{sub i}{sup 0}), singly positively charged gallium (Ga), indium (In) self-interstitials (I{sub III}{sup +}) and singly positively charged Ga, In vacancies (V{sub III}{sup +}). A new numerical method of solution to the system of diffusion equations, based on the finite difference approximations and Bairstow's method, is proposed.

  7. Effect of Inert Gas Additive Species on Cl(2) High Density Plasma Etching of Compound Semiconductors: Part 1. GaAs and GaSb

    SciTech Connect (OSTI)

    Abernathy, C.R.; Cho, H.; Hahn, Y.B.; Hays, D.C.; Jung, K.B.; Pearton, S.J.; Shul, R.J.

    1998-12-23T23:59:59.000Z

    The role of the inert gas additive (He, Ar, Xe) to C12 Inductively Coupled Plasmas for dry etching of GaAs and GaSb was examined through the effect on etch rate, surface roughness and near-surface stoichiometry. The etch rates for both materials go through a maximum with Clz 0/0 in each type of discharge (C12/'He, C12/Ar, C12/Xc), reflecting the need to have efficient ion-assisted resorption of the etch products. Etch yields initially increase strongly with source power as the chlorine neutral density increases, but decrease again at high powers as the etching becomes reactant-limited. The etched surfaces are generally smoother with Ax or Xe addition, and maintain their stoichiometry.

  8. Repetition of the shape of the ultrafast self-modulation of the optical absorption spectrum upon varying the energy of pulse of GaAs pumping

    SciTech Connect (OSTI)

    Ageeva, N. N.; Bronevoi, I. L., E-mail: bil@cplire.ru; Zabegaev, D. N.; Krivonosov, A. N. [Russian Academy of Sciences, Kotel'nikov Institute of Radio Engineering and Electronics (Russian Federation)

    2010-10-15T23:59:59.000Z

    Ultrafast self-modulation of the fundamental optical absorption emerges during intense picosecond optical pumping of GaAs and, according to the main assumption, reflects self-oscillations of depletion of electron populations in the conduction band. In this study, the quantitatively confirmed explanation of previously experimentally found cyclic repetition of the form of ultrafast self-modulation of the absorption spectrum upon varying the energy of the pumping pulse and fixed delay between pumping and probing (the measurement of absorption) is given. Repetition of the shape is explained by varying the phase of self-oscillations of the optical absorption. The explanation is based on the previously found experimentally dependence of the frequency of self-oscillations of absorption on the pumping energy. Therefore, this is also a new confirmation of the mentioned dependence (which satisfactorily coincides with a similar calculated dependence of the frequency of self-oscillations of depletion of populations).

  9. Polarity driven simultaneous growth of free-standing and lateral GaAsP epitaxial nanowires on GaAs (001) substrate

    SciTech Connect (OSTI)

    Sun, Wen; Xu, Hongyi [Materials Engineering, The University of Queensland, St Lucia QLD 40732 (Australia)] [Materials Engineering, The University of Queensland, St Lucia QLD 40732 (Australia); Guo, Yanan [Materials Engineering, The University of Queensland, St Lucia QLD 40732 (Australia) [Materials Engineering, The University of Queensland, St Lucia QLD 40732 (Australia); Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia); Gao, Qiang; Hoe Tan, Hark; Jagadish, Chennupati [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia)] [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia); Zou, Jin, E-mail: j.zou@uq.edu.au [Materials Engineering, The University of Queensland, St Lucia QLD 40732 (Australia) [Materials Engineering, The University of Queensland, St Lucia QLD 40732 (Australia); Centre for Microscopy and Microanalysis, The University of Queensland, St Lucia QLD 4072 (Australia)

    2013-11-25T23:59:59.000Z

    Simultaneous growth of ?111?{sub B} free-standing and ±[110] lateral GaAsP epitaxial nanowires on GaAs (001) substrates were observed and investigated by electron microscopy and crystallographic analysis. It was found that the growth of both free-standing and lateral ternary nanowires via Au catalysts was driven by the fact that Au catalysts prefer to maintain low-energy (111){sub B} interfaces with surrounding GaAs(P) materials: in the case of free-standing nanowires, Au catalysts maintain (111){sub B} interfaces with their underlying GaAsP nanowires; while in the case of lateral nanowires, each Au catalyst remain their side (111){sub B} interfaces with the surrounding GaAs(P) material during the lateral nanowire growth.

  10. Pre-photolithographic GaAs surface treatment for improved photoresist adhesion during wet chemical etching and improved wet etch profiles.

    SciTech Connect (OSTI)

    Martinez, Marino John; Clevenger, Jascinda; Austin, Franklin H., IV (, LMATA, Albuquerque, NM); Sullivan, Charles Thomas; Patrizi, Gary A.; Romero, Katherine (LMATA, Albuquerque, NM); Timon, Robert P.; Vigil, Pablita S. (LMATA, Albuquerque, NM); Grine, Alejandro J.

    2010-05-01T23:59:59.000Z

    Results of several experiments aimed at remedying photoresist adhesion failure during spray wet chemical etching of InGaP/GaAs NPN HBTs are reported. Several factors were identified that could influence adhesion and a Design of Experiment (DOE) approach was used to study the effects and interactions of selected factors. The most significant adhesion improvement identified is the incorporation of a native oxide etch immediately prior to the photoresist coat. In addition to improving adhesion, this pre-coat treatment also alters the wet etch profile of (100) GaAs so that the reaction limited etch is more isotropic compared to wafers without surface treatment; the profiles have a positive taper in both the [011] and [011] directions, but the taper angles are not identical. The altered profiles have allowed us to predictably yield fully probe-able HBTs with 5 x 5 {micro}m emitters using 5200 {angstrom} evaporated metal without planarization.

  11. Co doping enhanced giant magnetocaloric effect in Mn{sub 1-x}Co{sub x}As films epitaxied on GaAs (001)

    SciTech Connect (OSTI)

    Xu, P. F.; Nie, S. H.; Meng, K. K.; Wang, S. L.; Chen, L.; Zhao, J. H. [State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083 (China)

    2010-07-26T23:59:59.000Z

    A giant magnetocaloric effect was found in series of Mn{sub 1-x}Co{sub x}As films epitaxied on GaAs (001). The maximum magnetic entropy change caused by a magnetic field of 4 T is as large as 25 J/kg K around room temperature, which is about twice the value of pure MnAs film. The observed small thermal hysteresis is more suitable for practical application. Growing of layered Mn{sub 1-x}Co{sub x}As films with Co concentration changing gradually may draw layered active magnetic regenerator refrigerators closer to practical application. Our experimental result may provide the possibility for the combination of magnetocaloric effect and microelectronic circuitry.

  12. Structural properties of Bi{sub 2}Te{sub 3} and Bi{sub 2}Se{sub 3} topological insulators grown by molecular beam epitaxy on GaAs(001) substrates

    SciTech Connect (OSTI)

    Liu, X.; Leiner, J.; Dobrowolska, M.; Furdyna, J. K. [Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556 (United States); Smith, D. J. [Department of Physics, Arizona State University, Tempe, Arizona 85287 (United States); Fan, J. [Department of Physics, Arizona State University, Tempe, Arizona 85287 (United States); Center for Photonics Innovation, Arizona State University, Tempe, Arizona 85287 (United States); Zhang, Y.-H. [Center for Photonics Innovation, Arizona State University, Tempe, Arizona 85287 (United States); School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85287 (United States); Cao, H.; Chen, Y. P. [Department of Physics, Purdue University, West Lafayette, Indiana 47907 (United States); Kirby, B. J. [Center for Neutron Research, NIST, Gaithersburg, Maryland 20899 (United States)

    2011-10-24T23:59:59.000Z

    Thin films of Bi{sub 2}Te{sub 3} and Bi{sub 2}Se{sub 3} have been grown on deoxidized GaAs(001) substrates using molecular beam epitaxy. Cross-sectional transmission electron microscopy established the highly parallel nature of the Te(Se)-Bi-Te(Se)-Bi-Te(Se) quintuple layers deposited on the slightly wavy GaAs substrate surface and the different crystal symmetries of the two materials. Raman mapping confirmed the presence of the strong characteristic peaks reported previously for these materials in bulk form. The overall quality of these films reveals the potential of combining topological insulators with ferromagnetic semiconductors for future applications.

  13. MS Exam, Fall 2012, Solid State Electronic Devices (ECE 230A-B) 1. III-V compound semiconductor GaAs has two families of cleavage planes (110) and

    E-Print Network [OSTI]

    Wang, Deli

    MS Exam, Fall 2012, Solid State Electronic Devices (ECE 230A-B) ECE230A: 1. III-V compound of GaAs crystal. 1 #12;MS Exam, Fall 2012, Solid State Electronic Devices (ECE 230A-B) ECE 230B: Assume silicon, room temperature, complete ionization. 1. For an abrupt n+-p diode in Si, the n+ doping is 1020

  14. Measurement of the solar neutrino capture rate with gallium metal. III. Results for the 2002-2007 data-taking period

    SciTech Connect (OSTI)

    Abdurashitov, J. N.; Gavrin, V. N.; Gorbachev, V. V.; Gurkina, P. P.; Ibragimova, T. V.; Kalikhov, A. V.; Khairnasov, N. G.; Knodel, T. V.; Mirmov, I. N.; Shikhin, A. A.; Veretenkin, E. P.; Yants, V. E.; Zatsepin, G. T.; Bowles, T. J.; Elliott, S. R.; Teasdale, W. A.; Nico, J. S.; Cleveland, B. T.; Wilkerson, J. F. [Institute for Nuclear Research, Russian Academy of Sciences, RU-117312 Moscow (Russian Federation); Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States); National Institute of Standards and Technology, Stop 8461, Gaithersburg, Maryland 20899 (United States); University of Washington, Seattle, Washington 98195 (United States)

    2009-07-15T23:59:59.000Z

    The Russian-American experiment SAGE began to measure the solar neutrino capture rate with a target of gallium metal in December 1989. Measurements have continued with only a few brief interruptions since that time. In this article we present the experimental improvements in SAGE since its last published data summary in December 2001. Assuming the solar neutrino production rate was constant during the period of data collection, combined analysis of 168 extractions through December 2007 gives a capture rate of solar neutrinos with energy more than 233 keV of 65.4{sub -3.0}{sup +3.1} (stat) {sub -2.8}{sup +2.6} (syst) SNU. The weighted average of the results of all three Ga solar neutrino experiments, SAGE, Gallex, and GNO, is now 66.1{+-}3.1 SNU, where statistical and systematic uncertainties have been combined in quadrature. During the recent period of data collection a new test of SAGE was made with a reactor-produced {sup 37}Ar neutrino source. The ratio of observed to calculated rates in this experiment, combined with the measured rates in the three prior {sup 51}Cr neutrino-source experiments with Ga, is 0.87{+-}0.05. A probable explanation for this low result is that the cross section for neutrino capture by the two lowest-lying excited states in {sup 71}Ge has been overestimated. If we assume these cross sections are zero, then the standard solar model including neutrino oscillations predicts a total capture rate in Ga in the range of 63 SNU to 66 SNU with an uncertainty of about 4%, in good agreement with experiment. We derive the current value of the neutrino flux produced in the Sun by the proton-proton fusion reaction to be {phi}{sub pp}{sup {center_dot}}=(6.0{+-}0.8)x10{sup 10}/(cm{sup 2} s), which agrees well with the pp flux predicted by the standard solar model. Finally, we make several tests and show that the data are consistent with the assumption that the solar neutrino production rate is constant in time.

  15. Measurement of the solar neutrino capture rate with gallium metal. III: Results for the 2002--2007 data-taking period

    E-Print Network [OSTI]

    SAGE Collaboration; J. N. Abdurashitov; V. N. Gavrin; V. V. Gorbachev; P. P. Gurkina; T. V. Ibragimova; A. V. Kalikhov; N. G. Khairnasov; T. V. Knodel; I. N. Mirmov; A. A. Shikhin; E. P. Veretenkin; V. E. Yants; G. T. Zatsepin; T. J. Bowles; S. R. Elliott; W. A. Teasdale; J. S. Nico; B. T. Cleveland; J. F. Wilkerson

    2009-08-10T23:59:59.000Z

    The Russian-American experiment SAGE began to measure the solar neutrino capture rate with a target of gallium metal in Dec. 1989. Measurements have continued with only a few brief interruptions since that time. We give here the experimental improvements in SAGE since its last published data summary in Dec. 2001. Assuming the solar neutrino production rate was constant during the period of data collection, combined analysis of 168 extractions through Dec. 2007 gives a capture rate of solar neutrinos with energy more than 233 keV of 65.4 (+3.1)(-3.0) (stat) (+2.6)(-2.8) (syst) SNU. The weighted average of the results of all three Ga solar neutrino experiments, SAGE, Gallex, and GNO, is now 66.1 +/- 3.1 SNU, where statistical and systematic uncertainties have been combined in quadrature. During the recent period of data collection a new test of SAGE was made with a reactor-produced 37Ar neutrino source. The ratio of observed to calculated rates in this experiment, combined with the measured rates in the three prior 51Cr neutrino-source experiments with Ga, is 0.87 +/- 0.05. A probable explanation for this low result is that the cross section for neutrino capture by the two lowest-lying excited states in 71Ge has been overestimated. If we assume these cross sections are zero, then the standard solar model including neutrino oscillations predicts a total capture rate in Ga in the range of 63-66 SNU with an uncertainty of about 4%, in good agreement with experiment. We derive the current value of the neutrino flux produced in the Sun by the proton-proton fusion reaction to be (6.0 +/- 0.8) x 10^(10)/(cm^2 s), which agrees well with the pp flux predicted by the standard solar model. Finally, we show that the data are consistent with the assumption that the solar neutrino production rate is constant in time.

  16. Wafer Bonding and Epitaxial Transfer of GaSb-based Epitaxy to GaAs for Monolithic Interconnection of Thermophotovoltaic Devices

    SciTech Connect (OSTI)

    C.A. Wang; D.A. Shiau; P.G. Murphy; P.W. O'brien; R.K. Huang; M.K. Connors; A.C. Anderson; D. Donetsky; S. Anikeev; G. Belenky; D.M. Depoy; G. Nichols

    2003-06-16T23:59:59.000Z

    GaInAsSb/AlGaAsSb/InAsSb/GaSb epitaxial layers were bonded to semi-insulating GaAs handle wafers with SiO{sub x}/Ti/Au as the adhesion layer for monolithic interconnection of thermophotovoltaic (TPV) devices. Epitaxial transfer was completed by removal of the GaSb substrate, GaSb buffer, and InAsSb etch-stop layer by selective chemical etching. The SiO{sub x}/TiAu provides not only electrical isolation, but also high reflectivity and is used as an internal back-surface reflector. Characterization of wafer-bonded epitaxy by high-resolution x-ray diffraction and time-decay photoluminescence indicates minimal residual stress and enhancement in optical quality. 0.54-eV GaInAsSb cells were fabricated and monolithically interconnected in series. A 10-junction device exhibited linear voltage building with an open-circuit voltage of 1.8 V.

  17. Conversion of above- and below-bandgap photons via InAs quantum dot media embedded into GaAs solar cell

    SciTech Connect (OSTI)

    Sablon, K.; Little, J. [U.S. Army Research Laboratory, Adelphi, Maryland 20783 (United States); Vagidov, N. [Optoelectronic Nanodevices LLC, Amherst, New York 14226 (United States); Li, Y.; Mitin, V.; Sergeev, A. [EE Department, University at Buffalo—SUNY, Buffalo, New York 14260 (United States)

    2014-06-23T23:59:59.000Z

    Quantum dots (QDs) provide photovoltaic conversion of below-bandgap photons due to multistep electron transitions. QDs also increase conversion efficiency of the above-bandgap photons due to extraction of electrons from QDs via Coulomb interaction with hot electrons excited by high-energy photons. Nanoscale potential profile (potential barriers) and nanoscale band engineering (AlGaAs atomically thin barriers) allow for suppression of photoelectron capture to QDs. To study these kinetic effects and to distinguish them from the absorption enhancement due to light scattering on QDs, we investigate long, 3-?m base GaAs devices with various InAs QD media with 20 and 40 QD layers. Quantum efficiency measurements show that, at least at low doping, the multistep processes in QD media are strongly affected by the wetting layer (WL). The QD media with WLs provide substantial conversion of below-bandgap photons and for devices with 40 QD layers the short circuit current reaches 29.2?mA/cm{sup 2}. The QD media with band-engineered AlGaAs barriers and reduced wetting layers (RWL) enhance conversion of high-energy photons and decrease the relaxation (thermal) losses.

  18. Imaging with Mass Spectrometry: A SIMS and VUV-Photoionization Study of Ion-Sputtered Atoms and Clusters from GaAs and Au

    SciTech Connect (OSTI)

    Takahashi, Lynelle; Zhou, Jia; Wilson, Kevin R.; Leone, Stephen R.; Ahmed, Musahid

    2008-12-05T23:59:59.000Z

    A new mass spectrometry surface imaging method is presented in which ion-sputtered neutrals are postionized by wavelength-tunable vacuum ultraviolet (VUV) light from a synchrotron source. Mass spectra and signal counts of the photoionized neutrals from GaAs (100) and Au are compared to those of the secondary ions. While clusters larger than dimers are more efficiently detected as secondary ions, certain species, such as As2, Au and Au2, are more efficiently detected through the neutral channel. Continuously tuning the photon wavelength allows photoionization efficiency (PIE) curves to be obtained for sputtered Asm (m=1,2) and Aun (n=1-4). From the observed ionization thresholds, sputtered neutral As and Au show no clear evidence of electronic excitation, while neutral clusters have photoionization onsets shifted to lower energies by ~;;0.3 eV. These shifts are attributed to unresolved vibrational and rotational excitations. High-spatial resolution chemical imaging with synchrotron VUV postionization is demonstrated at two different photon energies using a copper TEM grid embedded in indium. The resulting images are used to illustrate the use of tunable VUV light for verifying mass peak assignments by exploiting the unique wavelength-dependent PIE of each sputtered neutral species. This capability is valuable for identifying compounds when imaging chemically complex systems with mass spectrometry-based techniques.

  19. Spin decoherence in n-type GaAs: The effectiveness of the third-body rejection method for electron-electron scattering

    SciTech Connect (OSTI)

    Marchetti, Gionni, E-mail: gionnimarchetti@gmail.com; Hodgson, Matthew, E-mail: matthew.hodgson@york.ac.uk; D'Amico, Irene, E-mail: irene.damico@york.ac.uk [Department of Physics, University of York, York, Heslington YO10 5DD (United Kingdom)

    2014-10-28T23:59:59.000Z

    We study the spin decoherence in n-type bulk GaAs for moderate electronic densities at room temperature using the Ensemble Monte Carlo method. We demonstrate that a technique called “third-body rejection method” devised by B. K. Ridley, J. Phys. C: Solid State Phys. 10, 1589 (1977) can be successfully adapted to Ensemble Monte Carlo method and used to tackle the problem of the electron-electron contribution to spin decoherence in the parameter region under study, where the electron-electron interaction can be reasonably described by a Yukawa potential. This scattering technique is employed in a doping region where one can expect that multiple collisions may play a role in carrier dynamics. By this technique, we are able to calculate spin relaxation times which are in very good agreement with the experimental results found by Oertel et al., Appl. Phys. Lett. 93, 13 (2008). Through this method, we show that the electron-electron scattering is overestimated in Born approximation, in agreement with previous results obtained by C. A. Kukkonen and H. Smith, Phys. Rev. B 8, 4601 (1973).

  20. Catastrophic degradation of InGaAsP/InGaP double-heterostructure lasers grown on (001) GaAs substrates by liquid-phase epitaxy

    SciTech Connect (OSTI)

    Ueda, O.; Wakao, K.; Komiya, S.; Yamaguchi, A.; Isozumi, S.; Umebu, I.

    1985-12-01T23:59:59.000Z

    Catastrophically degraded InGaAsP/InGaP double-heterostructure lasers grown on (001) GaAs substrates by liquid-phase epitaxy, emitting at 727 and 810 nm are investigated by photoluminescence topography, scanning electron microscopy, transmission electron microscopy, and energy dispersive x-ray spectroscopy. The degradation is mainly due to catastrophic optical damage at the facet, i.e., development of <110> dark-line defects from the facet, and rarely due to catastrophic optical damage at some defects, i.e., development of <110> dark-line defects from the defects inside the stripe region. These <110> dark-line defects correspond to complicated dislocation networks connected with dark knots, and are quite similar to those observed in catastrophically degraded GaAlAs/GaAs double-heterostructure lasers. The degradation characteristics of the InGaAsP/InGaP double-heterostructure lasers are rather similar to those in GaAlAs/GaAs double-heterostructure lasers concerning the catastrophic degradation.

  1. Sputtering of Si, SiC, InAs, InP, Ge, GaAs, GaSb, and GaN by electrosprayed nanodroplets

    SciTech Connect (OSTI)

    Borrajo-Pelaez, Rafael; Grustan-Gutierrez, Enric; Gamero-Castaño, Manuel, E-mail: mgameroc@uci.edu [Department of Mechanical and Aerospace Engineering, University of California, Irvine, California 92697 (United States)

    2013-11-14T23:59:59.000Z

    This article presents a characterization of the damage caused by energetic beams of electrosprayed nanodroplets striking the surfaces of single-crystal semiconductors including Si, SiC, InAs, InP, Ge, GaAs, GaSb, and GaN. The sputtering yield (number of atoms ejected per projectile's molecule), sputtering rate, and surface roughness are measured as functions of the beam acceleration potential. The maximum values of the sputtering yields range between 1.9 and 2.2 for the technological important but difficult to etch SiC and GaN respectively, and 4.5 for Ge. The maximum sputtering rates for the non-optimized beam flux conditions used in our experiments vary between 409?nm/min for SiC and 2381?nm/min for GaSb. The maximum sputtering rate for GaN is 630?nm/min. Surface roughness increases modestly with acceleration voltage, staying within 2?nm and 20?nm for all beamlet acceleration potentials and materials except Si. At intermediate acceleration potentials, the surface of Si is formed by craters orders of magnitude larger than the projectiles, yielding surface roughness in excess of 60?nm. The effect of projectile dose is studied in the case of Si. This parameter is correlated with the formation of the large craters typical of Si, which suggests that the accumulation of damage following consecutive impacts plays an important role in the interaction between beamlet and target.

  2. Sandia National Laboratories: gallium nitride

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    and Systems Dept.) recently published the article "Band offsets of La2O3 on (0001) GaN grown by reactive molecular-beam epitaxy" in Applied Physics Letters outlining research...

  3. Structural and band alignment properties of Al{sub 2}O{sub 3} on epitaxial Ge grown on (100), (110), and (111)A GaAs substrates by molecular beam epitaxy

    SciTech Connect (OSTI)

    Hudait, M. K.; Zhu, Y. [Advanced Devices and Sustainable Energy Laboratory (ADSEL), Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, Virginia 24061 (United States); Maurya, D.; Priya, S. [Center for Energy Harvesting Materials and Systems (CEHMS), Virginia Tech, Blacksburg, Virginia 24061 (United States); Patra, P. K. [Department of Biomedical Engineering and Department of Mechanical Engineering, University of Bridgeport, Bridgeport, Connecticut 06604 (United States); Ma, A. W. K. [Department of Chemical and Biomolecular Engineering and Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269 (United States); Aphale, A.; Macwan, I. [Department of Electrical and Computer Engineering, University of Bridgeport, Bridgeport, Connecticut 06604 (United States)

    2013-04-07T23:59:59.000Z

    Structural and band alignment properties of atomic layer Al{sub 2}O{sub 3} oxide film deposited on crystallographically oriented epitaxial Ge grown in-situ on (100), (110), and (111)A GaAs substrates using two separate molecular beam epitaxy chambers were investigated using cross-sectional transmission microscopy (TEM) and x-ray photoelectron spectroscopy (XPS). High-resolution triple axis x-ray measurement demonstrated pseudomorphic and high-quality Ge epitaxial layer on crystallographically oriented GaAs substrates. The cross-sectional TEM exhibited a sharp interface between the Ge epilayer and each orientation of the GaAs substrate as well as the Al{sub 2}O{sub 3} film and the Ge epilayer. The extracted valence band offset, {Delta}E{sub v}, values of Al{sub 2}O{sub 3} relative to (100), (110), and (111) Ge orientations using XPS measurement were 3.17 eV, 3.34 eV, and 3.10 eV, respectively. Using XPS data, variations in {Delta}E{sub v} related to the crystallographic orientation were {Delta}E{sub V}(110)Ge>{Delta}E{sub V}(100)Ge{>=}{Delta}E{sub V}(111)Ge and the conduction band offset, {Delta}E{sub c}, related to the crystallographic orientation was {Delta}E{sub c}(111)Ge>{Delta}E{sub c}(110)Ge>{Delta}E{sub c}(100)Ge using the measured {Delta}E{sub v}, bandgap of Al{sub 2}O{sub 3} in each orientation, and well-known Ge bandgap of 0.67 eV. These band offset parameters are important for future application of Ge-based p- and n-channel metal-oxide field-effect transistor design.

  4. Green (In,Ga,Al)P-GaP light-emitting diodes grown on high-index GaAs surfaces

    SciTech Connect (OSTI)

    Ledentsov, N. N., E-mail: nikolay.ledentsov@v-i-systems.com; Shchukin, V. A. [VI Systems GmbH, Hardenbergstr. 7, Berlin D-10623 (Germany); Lyytikäinen, J.; Okhotnikov, O. [Optoelectronics Research Centre, Tampere University of Technology, Tampere FI-33720 (Finland); Shernyakov, Yu. M.; Payusov, A. S.; Gordeev, N. Yu.; Maximov, M. V. [A. F. Ioffe Physical Technical Institute of the Russian Academy of Sciences, Politekhnicheskaya 26, St. Petersburg 194021 (Russian Federation); Schlichting, S.; Nippert, F.; Hoffmann, A. [Institut für Festkörperphysik, Technische Universität Berlin, Hardenbergstrasse 36, Berlin D-10623 (Germany)

    2014-11-03T23:59:59.000Z

    We report on green (550–560?nm) electroluminescence (EL) from (Al{sub 0.5}Ga{sub 0.5}){sub 0.5}In{sub 0.5}P-(Al{sub 0.8}Ga{sub 0.2}){sub 0.5}In{sub 0.5}P double p-i-n heterostructures with monolayer-scale GaP insertions in the cladding layers and light-emitting diodes based thereupon. The structures are grown side-by-side on high-index and (100) GaAs substrates by molecular beam epitaxy. At moderate current densities (?500?A/cm{sup 2}), the EL intensity of the structures is comparable for all substrate orientations. Opposite to the (100)-grown strictures, the EL spectra of (211) and (311)-grown devices are shifted towards shorter wavelengths (?550?nm at room temperature). At high current densities (>1?kA/cm{sup 2}), a much higher EL intensity is achieved for the devices grown on high-index substrates. The integrated intensity of (311)-grown structures gradually saturates at current densities above 4?kA/cm{sup 2}, whereas no saturation is revealed for (211)-grown structures up to the current densities above 14?kA/cm{sup 2}. We attribute the effect to the surface orientation-dependent engineering of the GaP band structure, which prevents the escape of the nonequilibrium electrons into the indirect conduction band minima of the p-doped (Al{sub 0.8}Ga{sub 0.2}){sub 0.5}In{sub 0.5}P cladding layers.

  5. The design of a concentrator solar array for use in low earth orbit 

    E-Print Network [OSTI]

    Kish, Guy Leslie

    1990-01-01T23:59:59.000Z

    to satellites. It is designed to utilize the ENTECH Incorporated Fresnel non-spherical dome concentrator lens in conjunction with gallium arsenide solar cells. The solar array structure is composed of aluminum metal matrix composite materials. Production... and manufacturing methods are determined for the aluminum composites and they are shown to be a material from which a satellite structure can be produced. These materials are shown to be compatible with electronic and optical components. Producers...

  6. Tilt generation in step-graded In{sub x}Ga{sub 1-x}As metamorphic pseudosubstrate on a singular GaAs substrate using a low-temperature grown InGaP interlayer

    SciTech Connect (OSTI)

    Ghanad Tavakoli, Shahram; Hulko, Oksana; Thompson, David A. [Department of Engineering Physics, 1280 Main Street West, Hamilton, Ontario L8S 4 L7 (Canada)

    2008-05-15T23:59:59.000Z

    Metamorphic pseudosubstrates of In{sub 0.42}Ga{sub 0.58}As were grown by molecular beam epitaxy using step-graded In{sub x}Ga{sub 1-x}As buffer layers grown either directly on a (001) GaAs substrate or on a GaAs substrate overgrown with a layer of low-temperature grown In{sub 0.51}Ga{sub 0.49}P (LT-InGaP). The structures were examined using x-ray reciprocal space mapping to determine the characteristics of the pseudosubstrates and buffer layers. For the sample grown on the LT-InGaP layer, the pseudosubstrate exhibited an asymmetric tilt around [110] toward the [110] direction. Weak-beam dark-field electron imaging shows an imbalance of misfit dislocations with opposite sign Burgers vector. An explanation for this tilt is given and it is suggested that it may be responsible for the improved quality of epitaxial layers grown on such pseudosubstrates.

  7. Gas-source molecular-beam epitaxy of InGaP and GaAs on strained-relaxed Ge{sub x}Si{sub 1-x}/Si

    SciTech Connect (OSTI)

    Kuo, J.M.; Fitzgerald, E.A.; Xie, Y.H. [AT& T Bell Lab., Murray Hill, NJ (United States)] [and others] [AT& T Bell Lab., Murray Hill, NJ (United States); and others

    1993-05-01T23:59:59.000Z

    Lattice-matched GaAs and InGaP structures on strain-relieved Ge/graded GeSi/Si without increasing the threading dislocation density at the III-V/Ge interface have been successfully grown. The results show that exposure of the Ge surface to As{sub 2} produces a drastic change in the step structure of the Ge surface. Subsequent exposure to Ga and continuation of growth invariably produces three-dimensional growth and a high threading dislocation density at the GaAs/Ge interface. However, exposure of the Ge surface to Ga does not appear to change the Ge step structure, and subsequent growth of GaAs leads to near two-dimensional growth and no massive increase in threading dislocation density at the GaAs/Ge interface as in the case of As{sub 2} exposure. InGaP light-emitting homojunction diodes have been fabricated on the relaxed Ge/graded GeSi/Si. Room-temperature operation was achieved with a surface-emitting output power of {approximately} 10 mW/cm{sup 2}. The best dislocation density achieved was 5x10{sup 6}-10{sup 7} cm{sup {minus}2} in the InGaP/GaAs/Ge/graded GeSi/Si structure. 9 refs., 3 figs.

  8. Molecular beam epitaxial growth of Bi{sub 2}Te{sub 3} and Sb{sub 2}Te{sub 3} topological insulators on GaAs (111) substrates: a potential route to fabricate topological insulator p-n junction

    SciTech Connect (OSTI)

    Zeng, Zhaoquan; Morgan, Timothy A.; Li, Chen; Hirono, Yusuke; Hu, Xian; Hawkridge, Michael E.; Benamara, Mourad; Salamo, Gregory J. [Arkansas Institute for Nanoscale Material Sciences and Engineering, University of Arkansas, Fayetteville, AR 72701 (United States)] [Arkansas Institute for Nanoscale Material Sciences and Engineering, University of Arkansas, Fayetteville, AR 72701 (United States); Fan, Dongsheng; Yu, Shuiqing [Arkansas Institute for Nanoscale Material Sciences and Engineering, University of Arkansas, Fayetteville, AR 72701 (United States) [Arkansas Institute for Nanoscale Material Sciences and Engineering, University of Arkansas, Fayetteville, AR 72701 (United States); Department of Electrical Engineering, University of Arkansas, Fayetteville, AR 72701 (United States); Zhao, Yanfei [International Center for Quantum Materials, School of Physics, Peking University, Beijing, 100871 (China)] [International Center for Quantum Materials, School of Physics, Peking University, Beijing, 100871 (China); Lee, Joon Sue [The Center for Nanoscale Science and Department of Physics, The Pennsylvania State University, University Park, PA 16802 (United States)] [The Center for Nanoscale Science and Department of Physics, The Pennsylvania State University, University Park, PA 16802 (United States); Wang, Jian [International Center for Quantum Materials, School of Physics, Peking University, Beijing, 100871 (China) [International Center for Quantum Materials, School of Physics, Peking University, Beijing, 100871 (China); The Center for Nanoscale Science and Department of Physics, The Pennsylvania State University, University Park, PA 16802 (United States); Wang, Zhiming M. [Arkansas Institute for Nanoscale Material Sciences and Engineering, University of Arkansas, Fayetteville, AR 72701 (United States) [Arkansas Institute for Nanoscale Material Sciences and Engineering, University of Arkansas, Fayetteville, AR 72701 (United States); State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China); Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Science, Beijing 100083 (China)

    2013-07-15T23:59:59.000Z

    High quality Bi{sub 2}Te{sub 3} and Sb{sub 2}Te{sub 3} topological insulators films were epitaxially grown on GaAs (111) substrate using solid source molecular beam epitaxy. Their growth and behavior on both vicinal and non-vicinal GaAs (111) substrates were investigated by reflection high-energy electron diffraction, atomic force microscopy, X-ray diffraction, and high resolution transmission electron microscopy. It is found that non-vicinal GaAs (111) substrate is better than a vicinal substrate to provide high quality Bi{sub 2}Te{sub 3} and Sb{sub 2}Te{sub 3} films. Hall and magnetoresistance measurements indicate that p type Sb{sub 2}Te{sub 3} and n type Bi{sub 2}Te{sub 3} topological insulator films can be directly grown on a GaAs (111) substrate, which may pave a way to fabricate topological insulator p-n junction on the same substrate, compatible with the fabrication process of present semiconductor optoelectronic devices.

  9. Determination of bandgap states in p-type In[subscript 0.49]Ga[subscript 0.51]P grown on SiGe/Si and GaAs by deep level optical spectroscopy and deep level transient spectroscopy

    E-Print Network [OSTI]

    Gonza?lez, M.

    The presence and properties of traps in p-type In[subscript 0.49]Ga[subscript 0.51]P grown on low dislocation density, metamorphic Ge/SiGe/Si substrates and GaAs substrates were determined using deep level transient ...

  10. Improvement of bias-stability in amorphous-indium-gallium-zinc-oxide thin-film transistors by using solution-processed Y{sub 2}O{sub 3} passivation

    SciTech Connect (OSTI)

    An, Sungjin; Mativenga, Mallory; Kim, Youngoo; Jang, Jin, E-mail: jjang@khu.ac.kr [Advanced Display Research Center, Department of Information Display, Kyung Hee University, Dongdaemun-gu, Seoul 130-701 (Korea, Republic of)

    2014-08-04T23:59:59.000Z

    We demonstrate back channel improvement of back-channel-etch amorphous-indium-gallium-zinc-oxide (a-IGZO) thin-film transistors by using solution-processed yttrium oxide (Y{sub 2}O{sub 3}) passivation. Two different solvents, which are acetonitrile (35%)?+?ethylene glycol (65%), solvent A and deionized water, solvent B are investigated for the spin-on process of the Y{sub 2}O{sub 3} passivation—performed after patterning source/drain (S/D) Mo electrodes by a conventional HNO{sub 3}-based wet-etch process. Both solvents yield devices with good performance but those passivated by using solvent B exhibit better light and bias stability. Presence of yttrium at the a-IGZO back interface, where it occupies metal vacancy sites, is confirmed by X-ray photoelectron spectroscopy. The passivation effect of yttrium is more significant when solvent A is used because of the existence of more metal vacancies, given that the alcohol (65% ethylene glycol) in solvent A may dissolve the metal oxide (a-IGZO) through the formation of alkoxides and water.

  11. Carrier transfer from InAs quantum dots to ErAs metal nanoparticles

    SciTech Connect (OSTI)

    Haughn, C. R.; Chen, E. Y.; Zide, J. M. O.; Doty, M. F., E-mail: doty@udel.edu [Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716 (United States); Steenbergen, E. H.; Bissell, L. J.; Eyink, K. G. [AFRL/RXAN, Wright Patterson AFB, Ohio 45433 (United States)

    2014-09-08T23:59:59.000Z

    Erbium arsenide (ErAs) is a semi-metallic material that self-assembles into nanoparticles when grown in GaAs via molecular beam epitaxy. We use steady-state and time-resolved photoluminescence to examine the mechanism of carrier transfer between indium arsenide (InAs) quantum dots and ErAs nanoparticles in a GaAs host. We probe the electronic structure of the ErAs metal nanoparticles (MNPs) and the optoelectronic properties of the nanocomposite and show that the carrier transfer rates are independent of pump intensity. This result suggests that the ErAs MNPs have a continuous density of states and effectively act as traps. The absence of a temperature dependence tells us that carrier transfer from the InAs quantum dots to ErAs MNPs is not phonon assisted. We show that the measured photoluminescence decay rates are consistent with a carrier tunneling model.

  12. arsenide photoconductive detectors: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    be destructive in some highly energetic cases, at least being responsible of a slow aging of the detector. So far one solution has been cascading several gain elements (GEM,...

  13. arsenide inas quantum: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    and Khaled Karraia photoluminescence from self-assembled InAs quantum dots depend on pumping power and vertical electric field. The In of Physics. DOI: 10.10631.1356445...

  14. arsenide superconductors including: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    to disfavor standard symmetric BCS pairing and may favor an inhomogeneous color superconducting phase. The properties of inhomogeneous color superconductors are discussed in...

  15. arsenide solar cells: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Pankaj J Edla; Dr. Bhupendra Gupta 92 Fully Solution-Processed Copper Chalcopyrite Thin Film Solar Cells: Materials Chemistry, Processing, and Device Physics University of...

  16. arsenide solar cell: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Pankaj J Edla; Dr. Bhupendra Gupta 92 Fully Solution-Processed Copper Chalcopyrite Thin Film Solar Cells: Materials Chemistry, Processing, and Device Physics University of...

  17. arsenide thin films: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    films Engineering Websites Summary: of domain switching and controllability, preventing thin-film and polycrystalline ferroelectrics from the switching mechanisms of...

  18. aluminium arsenide solar cells: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Cells Lecture 6: Solar Cells Solar Cell Technologies A) Crystalline Silicon B) Thin Film C) Group III-IV Cells 2Montana State University: Solar Cells Lecture 6:...

  19. Synthesis and Characterization of Bulk, Vitreous Cadmium Germanium Arsenide

    E-Print Network [OSTI]

    Rockett, Angus

    is presented to enable fabrication of high-purity, vitreous, crack-free ingots with sizes up to 10 mm diameter are the key function material in several important technological areas such as xerography,1 photovoltaics,2 formation within the CdGexAs2 system has been re- ported for x 5 0.02­1.3.12­18 The basic glass forming

  20. Quantitative analysis of compositional changes in InGaAs/InGaAsP quantum wells on GaAs induced by intermixing with a low temperature grown InGaP cap layer

    SciTech Connect (OSTI)

    Hulko, O.; Thompson, D. A.; Czaban, J. A.; Simmons, J. G. [Centre for Emerging Devices and Technologies (CEDT), McMaster University, Hamilton, Ontario L8S 4L8 (Canada)

    2006-08-07T23:59:59.000Z

    Energy-dispersive x-ray spectroscopy was used to analyze quantum well intermixing between an InGaAs quantum well (QW) and InGaAsP barriers grown on GaAs induced by a low temperature, molecular beam epitaxy grown, InGaP cap. This cap layer produces an enhanced blueshift of the photoluminescence (PL) wavelength following postgrowth annealing, and degradation of the PL signal. Cross-sectional transmission electron microscopy reveals modification of the whole structure, with formation of arsenic precipitates, broadening, and subsequent disappearance of the QWs in the capped structure. Uncapped samples are relatively unchanged. Increased phosphorus observed in the QW for capped structures confirms the diffusion of phosphorus from the P-rich cap.

  1. Room-temperature cw operation of InGaP/InGaAlP visible light laser diodes on GaAs substrates grown by metalorganic chemical vapor deposition

    SciTech Connect (OSTI)

    Ishikawa, M.; Ohba, Y.; Sugawara, H.; Yamamoto, M.; Nakanisi, T.

    1986-01-20T23:59:59.000Z

    Room-temperature cw operation for InGaP/InGaAlP double heterostructure (DH) laser diodes on GaAs substrates was achieved for the first time. The DH wafers were grown by low-pressure metalorganic chemical vapor deposition using methyl metalorganics. A lasing wavelength of 679 nm and a threshold current of 109 mA at 24C were obtained for an inner stripe structure laser diode with a 250- m-long and 7- m stripe geometry. The laser operated at up to 51C. The characteristic temperature T0 was 87 K at around room temperature. The lowest threshold current density, 5.0 kA/cmS, was obtained with a 20- m stripe width laser diode under room-temperature pulsed operation.

  2. Impact of stress relaxation in GaAsSb cladding layers on quantum dot creation in InAs/GaAsSb structures grown on GaAs (001)

    SciTech Connect (OSTI)

    Bremner, S. P. [School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney 2052 (Australia)] [School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney 2052 (Australia); Ban, K.-Y.; Faleev, N. N.; Honsberg, C. B. [School of Electrical, Computer and Energy Engineering, Ira A. Fulton Schools of Engineering, Solar Power Lab, Arizona State University, Tempe, Arizona 85287 (United States)] [School of Electrical, Computer and Energy Engineering, Ira A. Fulton Schools of Engineering, Solar Power Lab, Arizona State University, Tempe, Arizona 85287 (United States); Smith, D. J. [Department of Physics, Arizona State University, Tempe, Arizona 85287 (United States)] [Department of Physics, Arizona State University, Tempe, Arizona 85287 (United States)

    2013-09-14T23:59:59.000Z

    We describe InAs quantum dot creation in InAs/GaAsSb barrier structures grown on GaAs (001) wafers by molecular beam epitaxy. The structures consist of 20-nm-thick GaAsSb barrier layers with Sb content of 8%, 13%, 15%, 16%, and 37% enclosing 2 monolayers of self-assembled InAs quantum dots. Transmission electron microscopy and X-ray diffraction results indicate the onset of relaxation of the GaAsSb layers at around 15% Sb content with intersected 60° dislocation semi-loops, and edge segments created within the volume of the epitaxial structures. 38% relaxation of initial elastic stress is seen for 37% Sb content, accompanied by the creation of a dense net of dislocations. The degradation of In surface migration by these dislocation trenches is so severe that quantum dot formation is completely suppressed. The results highlight the importance of understanding defect formation during stress relaxation for quantum dot structures particularly those with larger numbers of InAs quantum-dot layers, such as those proposed for realizing an intermediate band material.

  3. Self- and zinc diffusion in gallium antimonide

    E-Print Network [OSTI]

    Nicols, Samuel Piers

    2002-01-01T23:59:59.000Z

    5, 265 (1957). S. Glasstone, K . Laidler, H . Eyring, Thequantity D . Henry Eyring [Glasstone, Eyring (1941)] was the

  4. Superconductive silicon nanowires using gallium beam lithography.

    SciTech Connect (OSTI)

    Henry, Michael David; Jarecki, Robert Leo,

    2014-01-01T23:59:59.000Z

    This work was an early career LDRD investigating the idea of using a focused ion beam (FIB) to implant Ga into silicon to create embedded nanowires and/or fully suspended nanowires. The embedded Ga nanowires demonstrated electrical resistivity of 5 m-cm, conductivity down to 4 K, and acts as an Ohmic silicon contact. The suspended nanowires achieved dimensions down to 20 nm x 30 nm x 10 m with large sensitivity to pressure. These structures then performed well as Pirani gauges. Sputtered niobium was also developed in this research for use as a superconductive coating on the nanowire. Oxidation characteristics of Nb were detailed and a technique to place the Nb under tensile stress resulted in the Nb resisting bulk atmospheric oxidation for up to years.

  5. Electronic properties of gallium nitride nanowires

    E-Print Network [OSTI]

    Yoon, Joonah

    2008-01-01T23:59:59.000Z

    This thesis presents a systematic study of the electrical transport in GaN nanowires. Particularly, the effect of the surrounding dielectric on the conductivity of GaN nanowires is experimentally shown for the first time. ...

  6. Efficient wireless charging with gallium nitride FETs

    E-Print Network [OSTI]

    Yeh, Theresa (Theresa I.)

    2014-01-01T23:59:59.000Z

    Though wireless charging is more convenient than traditional wired charging methods, it is currently less efficient. This not only wastes power but can also result in a longer charging time. Improving the efficiency of ...

  7. Interactions of gallium with zircaloy cladding

    E-Print Network [OSTI]

    Mitchell, Lee Josey

    1999-01-01T23:59:59.000Z

    like to thank Dr. Ron R. Hart, my advisor, for his help and direction through out the project. I would like to acknowledge J. Shipp for his help during the RBS analysis. I would also like to thank Dr. R. Guillemette for his help with the Electron... CHAPTER I INTRODUCTION The accepted options for the disposition of weapons-grade plutonium (WGPu) are immobilization or conversion to a mixed-oxide (MOX) reactor fuel. There are two benefits of conversion, one, the plutonium can't be converted back...

  8. Smooth cubic commensurate oxides on gallium nitride

    SciTech Connect (OSTI)

    Paisley, Elizabeth A.; Gaddy, Benjamin E.; LeBeau, James M.; Shelton, Christopher T.; Losego, Mark D.; Mita, Seiji; Collazo, Ramón; Sitar, Zlatko; Irving, Douglas L.; Maria, Jon-Paul, E-mail: jpmaria@ncsu.edu [Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695 (United States); Biegalski, Michael D.; Christen, Hans M. [Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

    2014-02-14T23:59:59.000Z

    Smooth, commensurate alloys of ?111?-oriented Mg{sub 0.52}Ca{sub 0.48}O (MCO) thin films are demonstrated on Ga-polar, c+ [0001]-oriented GaN by surfactant-assisted molecular beam epitaxy and pulsed laser deposition. These are unique examples of coherent cubic oxide|nitride interfaces with structural and morphological perfection. Metal-insulator-semiconductor capacitor structures were fabricated on n-type GaN. A comparison of leakage current density for conventional and surfactant-assisted growth reveals a nearly 100× reduction in leakage current density for the surfactant-assisted samples. HAADF-STEM images of the MCO|GaN interface show commensurate alignment of atomic planes with minimal defects due to lattice mismatch. STEM and DFT calculations show that GaN c/2 steps create incoherent boundaries in MCO over layers which manifest as two in-plane rotations and determine consequently the density of structural defects in otherwise coherent MCO. This new understanding of interfacial steps between HCP and FCC crystals identifies the steps needed to create globally defect-free heterostructures.

  9. Development of gallium nitride power transistors

    E-Print Network [OSTI]

    Piedra, Daniel, M. Eng. Massachusetts Institute of Technology

    2011-01-01T23:59:59.000Z

    GaN-based high-voltage transistors have outstanding properties for the development of ultra-high efficiency and compact power electronics. This thesis describes a new process technology for the fabrication of GaN power ...

  10. Copper Indium Gallium Diselenide | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative Fuels Data Center Home Page on Google Bookmark EERE: Alternative Fuels DataDepartment of Energy Your Density Isn't Your Destiny: Theof"Wave theJuly 30, 2013Department of Energy CoordinatingPhotovoltaics

  11. Nanobeam Photonic Crystal Cavity Light-Emitting Diodes

    E-Print Network [OSTI]

    Shambat, Gary; Petykiewicz, Jan; Mayer, Marie A; Sarmiento, Tomas; Harris, James; Haller, Eugene E; Vuckovic, Jelena

    2011-01-01T23:59:59.000Z

    We present results on electrically driven nanobeam photonic crystal cavities formed out of a lateral p-i-n junction in gallium arsenide. Despite their small conducting dimensions, nanobeams have robust electrical properties with high current densities possible at low drive powers. Much like their two-dimensional counterparts, the nanobeam cavities exhibit bright electroluminescence at room temperature from embedded 1,250 nm InAs quantum dots. A small room temperature differential gain is observed in the cavities with minor beam self-heating suggesting that lasing is possible. These results open the door for efficient electrical control of active nanobeam cavities for diverse nanophotonic applications.

  12. Design, fabrication, and analysis of p-channel arsenide/antimonide hetero-junction tunnel transistors

    SciTech Connect (OSTI)

    Rajamohanan, Bijesh, E-mail: bor5067@psu.edu; Mohata, Dheeraj; Hollander, Matthew; Datta, Suman [Department of Electrical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802 (United States); Zhu, Yan; Hudait, Mantu [Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, Virginia 24061 (United States); Jiang, Zhengping; Klimeck, Gerhard [Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47906 (United States)

    2014-01-28T23:59:59.000Z

    In this paper, we demonstrate InAs/GaSb hetero-junction (hetJ) and GaSb homo-junction (homJ) p-channel tunneling field effect transistors (pTFET) employing a low temperature atomic layer deposited high-? gate dielectric. HetJ pTFET exhibited drive current of 35 ?A/?m in comparison to homJ pTFET, which exhibited drive current of 0.3 ?A/?m at V{sub DS}?=??0.5?V under DC biasing conditions. Additionally, with pulsing of 1 ?s gate voltage, hetJ pTFET exhibited enhanced drive current of 85 ?A/?m at V{sub DS}?=??0.5?V, which is the highest reported in the category of III-V pTFET. Detailed device characterization was performed through analysis of the capacitance-voltage characteristics, pulsed current-voltage characteristics, and x-ray diffraction studies.

  13. E-Print Network 3.0 - arsenide-zinc selenide core-shell Sample...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    as 3D Scaffolds for New Materials: from Mechanically Strong Polymer Crosslinked Aerogels Summary: . Those 3D core-shell superstructures are true multifunctional materials...

  14. arsenide p-i-n detectors: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    be destructive in some highly energetic cases, at least being responsible of a slow aging of the detector. So far one solution has been cascading several gain elements (GEM,...

  15. arsenide oxides sr2cro3feas: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    gas phase oxidation of alkenes as propene to unsaturated aldehydes or ketones such as acrolein. A 19 Cu20 catalyst was used and periodically reactivated... Billingsley, David...

  16. arsenide junction-field-effect transistors: Topics by E-print...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    25 Next Page Last Page Topic Index 201 Proposal and design of a new SiC-emitter lateral NPM Schottky collector bipolar transistor on Engineering Websites Summary: for VLSI...

  17. Magnetism and superconductivi[t]y in Pr-based filled skutterudite arsenides

    E-Print Network [OSTI]

    Sayles, Todd Allen

    2008-01-01T23:59:59.000Z

    1.5 Superconductivity . . . . . . . . . . . . . . . . . . .and M. B. Maple, ”Superconductivity and non-Fermi liquidSAN DIEGO Magnetism and Superconductiviy in Pr-based Filled

  18. Magnetism and superconductivi[t]y in Pr-based filled skutterudite arsenides

    E-Print Network [OSTI]

    Sayles, Todd Allen

    2008-01-01T23:59:59.000Z

    1.3 Magnetism . . . . .1.3.3 Itinerant Magnetism . . . . . . . . . . .3.3 Magnetism . . . . . . . . . . . . . . . . . . . . . 3.4

  19. Morphology Control of Layer-Structured Gallium Selenide Nanowires

    E-Print Network [OSTI]

    Cui, Yi

    for stable photocathodes and battery electrodes. We report the controlled synthesis and characterization cells3 and solid-state batteries.4 Their one-dimensional nanowire (NW) structures may afford better

  20. Electronic Transport Characteristics of Gallium Nitride Nanowire-based Nanocircuits

    E-Print Network [OSTI]

    Ayres, Virginia

    . The measurements indicate a working field effect transistor utilizing a global back gate configuration. Very high and drain contacts were patterned using electron beam lithography, with Ti/Au used for the conducting source and drain material. The backside of the wafer was stripped of silicon dioxide using hydrofluoric acid and Ti

  1. Neutron irradiation effects on metal-gallium nitride contacts

    SciTech Connect (OSTI)

    Katz, Evan J.; Lin, Chung-Han; Zhang, Zhichun [Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210 (United States); Qiu, Jie; Cao, Lei [Nuclear Engineering Program, Department of Mechanical and Aerospace Engineering, The Ohio State University, Columbus, Ohio 43210 (United States); Mishra, Umesh K. [Departments of Electrical and Computer Engineering and Materials Science and Engineering University of California, Santa Barbara, California 93106 (United States); Brillson, Leonard J., E-mail: brillson.1@osu.edu [Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210 (United States); Department of Physics and Center for Materials Research, The Ohio State University, Columbus, Ohio 43210 (United States)

    2014-03-28T23:59:59.000Z

    We have measured the effect of fast and thermal neutrons on GaN Schottky barriers and ohmic contacts using current–voltage and transmission line method electrical techniques, optical, atomic force and scanning electron microscopy morphological techniques, and X-ray photoemission spectroscopy chemical techniques. These studies reveal a 10{sup 15}?n/cm{sup 2} neutron threshold for Schottky barrier ideality factor increases, a 10{sup 15}?n/cm{sup 2} fast plus thermal neutron threshold for ohmic contact sheet and contact resistance increases, and 10{sup 16}?n/cm{sup 2} neutron fluence threshold for major device degradation identified with thermally driven diffusion of Ga and N into the metal contacts and surface phase changes. These results demonstrate the need for protecting metal-GaN contacts in device applications subject to neutron radiation.

  2. Neutron irradiation effects on gallium nitride-based Schottky diodes

    SciTech Connect (OSTI)

    Lin, Chung-Han; Katz, Evan J.; Zhang, Zhichun [Department of Electrical and Computer Engineering, The Ohio State University, Columbus Ohio 43210 (United States)] [Department of Electrical and Computer Engineering, The Ohio State University, Columbus Ohio 43210 (United States); Qiu, Jie; Cao, Lei [Nuclear Engineering Program, Department of Mechanical and Aerospace Engineering, The Ohio State University, Columbus, Ohio 43210 (United States)] [Nuclear Engineering Program, Department of Mechanical and Aerospace Engineering, The Ohio State University, Columbus, Ohio 43210 (United States); Mishra, Umesh K. [Departments of Electrical and Computer Engineering and Materials Science and Engineering, University of California, Santa Barbara, California 93106 (United States)] [Departments of Electrical and Computer Engineering and Materials Science and Engineering, University of California, Santa Barbara, California 93106 (United States); Brillson, Leonard J. [Department of Electrical and Computer Engineering, The Ohio State University, Columbus Ohio 43210 (United States) [Department of Electrical and Computer Engineering, The Ohio State University, Columbus Ohio 43210 (United States); Department of Physics and Center for Materials Research, The Ohio State University, Columbus, Ohio 43210 (United States)

    2013-10-14T23:59:59.000Z

    Depth-resolved cathodoluminescence spectroscopy (DRCLS), time-resolved surface photovoltage spectroscopy, X-ray photoemission spectroscopy (XPS), and current-voltage measurements together show that fast versus thermal neutrons differ strongly in their electronic and morphological effects on metal-GaN Schottky diodes. Fast and thermal neutrons introduce GaN displacement damage and native point defects, while thermal neutrons also drive metallurgical reactions at metal/GaN interfaces. Defect densities exhibit a threshold neutron fluence below which thermal neutrons preferentially heal versus create new native point defects. Scanning XPS and DRCLS reveal strong fluence- and metal-dependent electronic and chemical changes near the free surface and metal interfaces that impact diode properties.

  3. Superconductivity in gallium-substituted Ba8Si46 clathrates

    E-Print Network [OSTI]

    Li, Yang; Zhang, Ruihong; Liu, Yang; Chen, Ning; Luo, Z. P.; Ma, Xingqiao; Cao, Guohui; Feng, Z. S.; Hu, Chia-Ren; Ross, Joseph H., Jr.

    2007-01-01T23:59:59.000Z

    superconductor, with an onset at T-C approximate to 3.3 K. For x=10 and higher, no superconductivity was observed down to T=1.8 K. This represents a strong suppression of superconductivity with increasing Ga content, compared to Ba8Si46 with T-C approximate to 8...

  4. Production of gallium-66, a positron emitting nuclide for radioimmunotherapy

    SciTech Connect (OSTI)

    Mirzadeh, S. (Oak Ridge National Lab., TN (United States)); Chu, Y.Y. (Brookhaven National Lab., Upton, NY (United States))

    1991-01-01T23:59:59.000Z

    Excitation functions for production of {sup 66}Ga via {alpha}-induced nuclear reactions on enriched {sup 66}Zn and {sup 64}Zn have been measured with E{sub {alpha}}{le}27.3 MeV and E{sub {alpha}}{le}43.7 MeV employing the stack-thin target technique. In addition, the induced activity of {sup 67} Ga in the same sets of targets allowed an evaluation of the excitation functions of the corresponding nuclear reactions.

  5. Production of gallium-66, positron emitting nuclide for radioimmumotherapy

    SciTech Connect (OSTI)

    Mirzadeh, S. (Oak Ridge National Lab., TN (USA)); Chu, Yung Yee (Brookhaven National Lab., Upton, NY (USA))

    1991-01-01T23:59:59.000Z

    Excitation functions for production of {sup 66}Ga via {alpha}-induced nuclear reactions on enriched {sup 66}Zn have been measured with E{sub {alpha}}{le}27.3 MeV and E{sub {alpha}}{le}43.7 MeV employing the stack-thin target technique. In addition, the induced activity of {sup 67}Ga in the same sets of targets allowed an evaluation of the excitation functions of the corresponding nuclear reactions. 17 refs., 2 figs., 2 tabs.

  6. Production of gallium-66, a positron emitting nuclide for radioimmunotherapy

    SciTech Connect (OSTI)

    Mirzadeh, S. [Oak Ridge National Lab., TN (United States); Chu, Y.Y. [Brookhaven National Lab., Upton, NY (United States)

    1991-12-31T23:59:59.000Z

    Excitation functions for production of {sup 66}Ga via {alpha}-induced nuclear reactions on enriched {sup 66}Zn and {sup 64}Zn have been measured with E{sub {alpha}}{le}27.3 MeV and E{sub {alpha}}{le}43.7 MeV employing the stack-thin target technique. In addition, the induced activity of {sup 67} Ga in the same sets of targets allowed an evaluation of the excitation functions of the corresponding nuclear reactions.

  7. Advanced Epi Tools for Gallium Nitride Light Emitting Diode Devices

    SciTech Connect (OSTI)

    Patibandla, Nag; Agrawal, Vivek

    2012-12-01T23:59:59.000Z

    Over the course of this program, Applied Materials, Inc., with generous support from the United States Department of Energy, developed a world-class three chamber III-Nitride epi cluster tool for low-cost, high volume GaN growth for the solid state lighting industry. One of the major achievements of the program was to design, build, and demonstrate the world’s largest wafer capacity HVPE chamber suitable for repeatable high volume III-Nitride template and device manufacturing. Applied Materials’ experience in developing deposition chambers for the silicon chip industry over many decades resulted in many orders of magnitude reductions in the price of transistors. That experience and understanding was used in developing this GaN epi deposition tool. The multi-chamber approach, which continues to be unique in the ability of the each chamber to deposit a section of the full device structure, unlike other cluster tools, allows for extreme flexibility in the manufacturing process. This robust architecture is suitable for not just the LED industry, but GaN power devices as well, both horizontal and vertical designs. The new HVPE technology developed allows GaN to be grown at a rate unheard of with MOCVD, up to 20x the typical MOCVD rates of 3{micro}m per hour, with bulk crystal quality better than the highest-quality commercial GaN films grown by MOCVD at a much cheaper overall cost. This is a unique development as the HVPE process has been known for decades, but never successfully commercially developed for high volume manufacturing. This research shows the potential of the first commercial-grade HVPE chamber, an elusive goal for III-V researchers and those wanting to capitalize on the promise of HVPE. Additionally, in the course of this program, Applied Materials built two MOCVD chambers, in addition to the HVPE chamber, and a robot that moves wafers between them. The MOCVD chambers demonstrated industry-leading wavelength yield for GaN based LED wafers and industry-leading uptime enabled in part by a novel in-situ cleaning process developed in this program.

  8. Superconductivity in gallium-substituted Ba8Si46 clathrates 

    E-Print Network [OSTI]

    Li, Yang; Zhang, Ruihong; Liu, Yang; Chen, Ning; Luo, Z. P.; Ma, Xingqiao; Cao, Guohui; Feng, Z. S.; Hu, Chia-Ren; Ross, Joseph H., Jr.

    2007-01-01T23:59:59.000Z

    superconductor, with an onset at T-C approximate to 3.3 K. For x=10 and higher, no superconductivity was observed down to T=1.8 K. This represents a strong suppression of superconductivity with increasing Ga content, compared to Ba8Si46 with T-C approximate to 8...

  9. Rutherford backscattering analysis of gallium implanted 316 stainless steel 

    E-Print Network [OSTI]

    Ortensi, Javier

    2000-01-01T23:59:59.000Z

    Ion implantation of Ga ions into 316 stainless steel was performed at fluences ranging from 8x10¹? to 10¹? ions/cm². The depth profile of Ga in the steel was analyzed via Rutherford Backscattering and ToFSIMS. The surface effects were...

  10. Strongly localized excitons in gallium nitride C. Wetzel,a)

    E-Print Network [OSTI]

    Wetzel, Christian M.

    report on strong excitonic luminescence in wurtzite GaN at 3.309 and 3.365 eV T 6 K . These lines lie and characterization of excitonic luminescence transitions in wurtzite GaN about 150 meV below the fundamental elec transitions at 3.309 and 3.365 eV. Wurtzite GaN epilayers were grown by a high tempera- ture vapor phase

  11. GALLIUM--1997 29.1 By Deborah A. Kramer

    E-Print Network [OSTI]

    players. They also are used in short-range fiber optic communications systems, satellite communicationsAs is manufactured into optoelectronic devices (LED's, laser diodes, photodetectors, and solar cells) and integrated energy to a coherent light output. Laser diodes, also called semiconductor lasers or injection laser

  12. Rutherford backscattering analysis of gallium implanted 316 stainless steel

    E-Print Network [OSTI]

    Ortensi, Javier

    2000-01-01T23:59:59.000Z

    % was attained at 300 [] and deeper. The possible enhanced diffusion of Ga was observed, but not necessarily through the grain boundaries. Although there was no indication of compound formation, significant pitting was observed at high fluences. Repassivation...

  13. Gallium Nitride Integrated Gas/Temperature Sensors for

    E-Print Network [OSTI]

    precision and accuracy · Field test for reliability and lifetime · 1) Sensor Needs and Requirements://www.ott.doe.gov/pdfs/sensor_needs.pdf #12;4 Approach GaN based devices and circuits are an attractive option for high temperature electronic) and hydrogen (30-70%) 80% Complete 2- Determine confounding effects due to multiple components 80% Complete 3

  14. High Quality, Low Cost Bulk Gallium Nitride Substrates Grown...

    Energy Savers [EERE]

    silicon Widespread adoption of efficient load architectures enabled by GaN-based power electronics and lighting can lead to a 25% reduction in world energy consumption ...

  15. abdominal gallium-67 citrate: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    species (bigeye, Thunnus obesus; yellowfin, T. albacares; and skipjack, Katsuwonus pelamis) Environmental Sciences and Ecology Websites Summary: : 26 October 2004 Key words:...

  16. aluminium gallium indium: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    on which all indium abundance studies are based, both for the quiet-sun and the sunspot umbra spectrum, employing standard atmosphere models and accounting for hyperfine structure...

  17. aluminum gallium indium: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    on which all indium abundance studies are based, both for the quiet-sun and the sunspot umbra spectrum, employing standard atmosphere models and accounting for hyperfine structure...

  18. amorphous indium gallium: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    on which all indium abundance studies are based, both for the quiet-sun and the sunspot umbra spectrum, employing standard atmosphere models and accounting for hyperfine structure...

  19. Vacancy-Induced Nanoscale Wire Structure in Gallium Selenide...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Structural vacancies are a source of numerous interesting structural, electronic, and optical properties, and materials scientists often rely them as an important building...

  20. Process for growing epitaxial gallium nitride and composite wafers

    DOE Patents [OSTI]

    Weber, Eicke R.; Subramanya, Sudhir G.; Kim, Yihwan; Kruger, Joachim

    2003-05-13T23:59:59.000Z

    A novel growth procedure to grow epitaxial Group III metal nitride thin films on lattice-mismatched substrates is proposed. Demonstrated are the quality improvement of epitaxial GaN layers using a pure metallic Ga buffer layer on c-plane sapphire substrate. X-ray rocking curve results indicate that the layers had excellent structural properties. The electron Hall mobility increases to an outstandingly high value of .mu.>400 cm.sup.2 /Vs for an electron background concentration of 4.times.10.sup.17 cm.sup.-3.

  1. Electrochemical Solution Growth: Gallium Nitride Crystal Growth - Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOEThe Bonneville Power AdministrationField Campaign:INEAWater Use

  2. Vacancy-Induced Nanoscale Wire Structure in Gallium Selenide Layers

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level:Energy: Grid Integration Redefining What'sis Taking Over OurThe Iron SpinPrincetonUsing Maps to Predict4Vacancy announcements Alumni

  3. Vacancy-Induced Nanoscale Wire Structure in Gallium Selenide Layers

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level:Energy: Grid Integration Redefining What'sis Taking Over OurThe Iron SpinPrincetonUsing Maps to Predict4Vacancy announcements

  4. Vacancy-Induced Nanoscale Wire Structure in Gallium Selenide Layers

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level:Energy: Grid Integration Redefining What'sis Taking Over OurThe Iron SpinPrincetonUsing Maps to Predict4Vacancy announcementsVacancy-Induced

  5. Vacancy-Induced Nanoscale Wire Structure in Gallium Selenide Layers

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level:Energy: Grid Integration Redefining What'sis Taking Over OurThe Iron SpinPrincetonUsing Maps to Predict4Vacancy

  6. Vacancy-Induced Nanoscale Wire Structure in Gallium Selenide Layers

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level:Energy: Grid Integration Redefining What'sis Taking Over OurThe Iron SpinPrincetonUsing Maps to Predict4VacancyVacancy-Induced Nanoscale Wire

  7. Light-Emitting Diodes on Semipolar Bulk Gallium Nitride Substrate |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative Fuels Data Center Home Page on Google Bookmark EERE: Alternative Fuels Data Center Home Page onYouTube YouTube Note: Since the.pdfBreaking ofOil & Gas »ofMarketing | Department ofEnergy Nuclear

  8. Vacancy-Induced Nanoscale Wire Structure in Gallium Selenide Layers

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645U.S. DOE Office of ScienceandMesa del SolStrengthening aTurbulenceUtilize Available Resources Print AsVacancy-Induced

  9. High-Quality, Low-Cost Bulk Gallium Nitride Substrates

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative Fuels Data Center Home Page on Google Bookmark EERE: Alternative Fuels DataDepartment of Energy Your Density Isn't YourTransport(Fact Sheet), GeothermalGridHYDROGEND D e e p p a a r rRancho Cordoba,High-Quality,

  10. NREL photovoltaic subcontract reports: Abstracts and document control information, 1 August 1991--31 July 1992

    SciTech Connect (OSTI)

    Not Available

    1992-08-01T23:59:59.000Z

    This report contains document control information and abstracts for the National Renewable Energy Laboratory (NREL) subcontracted photovoltaic program publications. It also lists source information on additional publications that describe US Department of Energy (DOE) PV research activities. It is not totally exhaustive, so it lists NREL contacts for requesting further information on the DOE and NREL PV programs. This report covers the period from August 1, 1991, through July 31, 1992. The purpose of continuing this type of publication is to help people keep abreast of specific PV interests, while maintaining a balance on the costs to the PV program. The information in this report is organized under PV technology areas: Amorphous silicon research; polycrystalline thin films (including copper indium diselenide, cadmium telluride, and thin-film silicon); crystalline materials and advanced concepts (including silicon, gallium arsenide, and other group III-V materials); and PV manufacturing technology development (which may include manufacturing information for various types of PV materials).

  11. JOURNAL DE PHYSIQUE CoZZoque C l , supplment au no 10, Tome 43, octobre 1982

    E-Print Network [OSTI]

    Boyer, Edmond

    n e s d'arsëniure de gallium c a r a c t é r i --sees par un degré variable de désordre ont été, t o be a very successful method i n t h e product- i o n o f high q u a l i t y GaAs films r a r e o r mostly obtained on the amorphous s t a t e [6,7 ] . I n t h i s direction, we want t o

  12. Liquid phase epitaxial growth of GaAs

    SciTech Connect (OSTI)

    Wynne, D I [Univ. of California, Berkeley, CA (United States). Materials Science and Mineral Engineering

    1997-10-01T23:59:59.000Z

    Research into new semiconductor materials for measurement of electromagnetic radiation over a wide range of energies has been an active field for several decades. There is a strong desire to identify and develop new materials which can lead to improved detectors. Such devices are expected to solve problems that cannot be solved using the semiconductor materials and device structures which have been traditionally used for radiation detection. In order for a detector which is subjected to some type of irradiation to respond, the radiation must undergo an interaction with the detector. The net result of the radiation interaction in a broad category of detectors is the generation of mobile electric charge carriers (electrons and/or holes) within the detector active volume. This charge is collected at the detector contacts and it forms the basic electrical signal. Typically, the collection of the charge is accomplished through the imposition of an electric field within the detector which causes the positive and/or negative charges created by the radiation to flow in opposite directions to the contacts. For the material to serve as a good radiation detector, a large fraction (preferably 100%) of all carriers created by the interacting incident radiation must be collected. Charge trapping by deep level impurities and structural defects can seriously degrade detector performance. The focus of this thesis is on far infrared and X-ray detection. In X-ray detector applications of p-I-n diodes, the object is to measure accurately the energy distribution of the incident radiation quanta. One important property of such detectors is their ability to measure the energy of individual incident photons with high energy resolution.

  13. (Data in kilograms of gallium content unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2011. One company in Utah

    E-Print Network [OSTI]

    % was used in research and development, specialty alloys, and other applications. Optoelectronic devices were used in areas such as aerospace, consumer goods, industrial equipment, medical equipment

  14. (Data in kilograms of gallium content, unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2001. Two companies in

    E-Print Network [OSTI]

    , specialty alloys, and other applications. Optoelectronic devices were used in areas such as consumer goods, medical equipment, industrial components, telecommunications, and aerospace applications. Integrated

  15. (Data in kilograms of gallium content, unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2000. Two companies in

    E-Print Network [OSTI]

    and development, specialty alloys, and other applications. Optoelectronic devices were used in areas such as consumer goods, medical equipment, industrial components, telecommunications, and aerospace applications

  16. (Data in kilograms of gallium content, unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2003. One company in

    E-Print Network [OSTI]

    , specialty alloys, and other applications. Optoelectronic devices were used in areas such as aerospace

  17. (Data in kilograms of gallium content unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2006. One company in Utah

    E-Print Network [OSTI]

    , specialty alloys, and other applications. Optoelectronic devices were used in areas such as aerospace

  18. (Data in kilograms of gallium content unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2010. One company in Utah

    E-Print Network [OSTI]

    and development, specialty alloys, and other applications. Optoelectronic devices were used in areas such as aerospace, consumer goods, industrial equipment, medical equipment, and telecommunications. ICs were used

  19. (Data in kilograms of gallium content unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2007. One company in Utah

    E-Print Network [OSTI]

    and development, specialty alloys, and other applications. Optoelectronic devices were used in areas such as aerospace, consumer goods, industrial equipment, medical equipment, and telecommunications. ICs were used

  20. (Data in kilograms of gallium content unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2004. One company in Utah

    E-Print Network [OSTI]

    % was used in research and development, specialty alloys, and other applications. Optoelectronic devices were used in areas such as aerospace, consumer goods, industrial equipment, medical equipment

  1. (Data in kilograms of gallium content unless otherwise noted) Domestic Production and Use: No domestic primary gallium recovery was reported in 2008. One company in Utah

    E-Print Network [OSTI]

    and development, specialty alloys, and other applications. Optoelectronic devices were used in areas such as aerospace, consumer goods, industrial equipment, medical equipment, and telecommunications. ICs were used

  2. Synthesis and characterization of visible emission from rare-earth doped aluminum nitride, gallium nitride and gallium aluminum nitride powders and thin films

    E-Print Network [OSTI]

    Tao, Jonathan Huai-Tse

    2010-01-01T23:59:59.000Z

    Converted White-Light-Emitting Diodes," Jap. J. Appl.doped III-N Light-Emitting Diodes," Appl. Phys. Lett. , 84 (in Packaging High Power Light Emitting Diode Arrays," Appl.

  3. Synthesis and characterization of visible emission from rare-earth doped aluminum nitride, gallium nitride and gallium aluminum nitride powders and thin films

    E-Print Network [OSTI]

    Tao, Jonathan Huai-Tse

    2010-01-01T23:59:59.000Z

    High-Color-Rendering LED Lamps Using Oxyfluoride andHigh-pressure mercury lamp LED Luxeon white 5 W LED Cree LRpressure mercury lamps; some Cree LEDs have even comparable

  4. Synthesis and characterization of visible emission from rare-earth doped aluminum nitride, gallium nitride and gallium aluminum nitride powders and thin films

    E-Print Network [OSTI]

    Tao, Jonathan Huai-Tse

    2010-01-01T23:59:59.000Z

    from GaN:Tb 3+ Powders and Thin Films Deposited by MOVPE andHirata, "Eu 3+ Activated GaN Thin Films Grown on Sapphire byTb 3+ in GaN Powders and Thin Films," ECS Trans. , J. Laski,

  5. Synthesis and characterization of visible emission from rare-earth doped aluminum nitride, gallium nitride and gallium aluminum nitride powders and thin films

    E-Print Network [OSTI]

    Tao, Jonathan Huai-Tse

    2010-01-01T23:59:59.000Z

    Growth of Single Crystal GaN Substrate using Hydride VaporZnO Nanowire on a p-GaN Substrate," J. Phys. Chem. C , 114Grown on GaN Nanocrystalline Powder Substrate," J. Cryst.

  6. Synthesis, characterization, and exciton dynamics of II-VI semiconducting nanomaterials and ab-initio studies for applications in explosives sensing

    E-Print Network [OSTI]

    Cooper, Jason Kyle

    2013-01-01T23:59:59.000Z

    gallium diselenide (CIGS) solar cells were studied. TheCIGS (copper indium gallium diselenide) thin film solar cells

  7. Synthesis, characterization, and biotemplated assembly of indium nitride and indium gallium nitride nanoparticles

    E-Print Network [OSTI]

    Hsieh, Jennifer Chia-Jen

    2010-01-01T23:59:59.000Z

    A low-temperature, ambient pressure solution synthesis of colloidal InN nanoparticles is presented. This synthesis utilizes a previously dismissed precursor and results in individual, non-aggregated nanoparticles with ...

  8. Radiolabeled porphyrin versus gallium-67 citrate for the detection of human melanoma in athymic mice

    SciTech Connect (OSTI)

    Maric, N.; Chan, S. Ming; Hoffer, P.B.; Duray, P.

    1987-01-01T23:59:59.000Z

    We performed the biodistribution and imaging studies of /sup 111/In and /sup 67/Ga labeled tetra(4-N-methylpyridyl) porphine, (T4NMPYP), and compared it to that of /sup 67/Ga citrate in athymic mice bearing a human melanoma xenograft. The biodistribution results of both /sup 111/In and /sup 67/Ga labeled T4NMPYP (3, 6, 24, and 48 hours) were similar but differed from that of /sup 67/Ga citrate (48 hours). The optimum tumor uptake of both radiolabeled porphyrins was at 6 hours postinjection and was lower than the tumor uptake of /sup 67/Ga citrate at 48 hours postinjection. Kidney was the only organ showing higher uptake of radiolabeled porphyrin compared to that of /sup 67/Ga citrate. The imaging studies performed with /sup 111/In T4NMPYP and /sup 67/Ga citrate correspond to the biodistribution results. Osteomyelitis present in one mouse showed good localization of /sup 111/In T4NMPYP. 15 refs., 3 figs., 5 tabs.

  9. Electrical properties of atomic layer deposited aluminum oxide on gallium nitride

    SciTech Connect (OSTI)

    Esposto, Michele; Krishnamoorthy, Sriram; Nath, Digbijoy N.; Bajaj, Sanyam; Hung, Ting-Hsiang; Rajan, Siddharth

    2011-09-26T23:59:59.000Z

    We report on our investigation of the electrical properties of metal/Al{sub 2}O{sub 3}/GaN metal-insulator-semiconductor capacitors. We determined the conduction band offset and interface charge density of the alumina/GaN interface by analyzing the capacitance-voltage characteristics of atomic layer deposited Al{sub 2}O{sub 3} films on GaN substrates. The conduction band offset at the Al{sub 2}O{sub 3}/GaN interface was calculated to be 2.13 eV, in agreement with theoretical predications. A non-zero field of 0.93 MV/cm in the oxide under flat-band conditions in the GaN was inferred, which we attribute to a fixed net positive charge density of magnitude 4.60 x 10{sup 12 }cm{sup -2} at the Al{sub 2}O{sub 3}/GaN interface. We provide hypotheses to explain the origin of this charge by analyzing the energy band line-up.

  10. Commercialization of gallium nitride nanorod arrays on silicon for solid-state lighting

    E-Print Network [OSTI]

    Wee, Qixun

    2008-01-01T23:59:59.000Z

    One important component in energy usage is lighting, which is currently dominated by incandescent and fluorescent lamps. However, due to potentially higher efficiencies and thus higher energy savings, solid-state lighting ...

  11. The equilibrium state of hydrogen in gallium nitride: Theory and experiment

    SciTech Connect (OSTI)

    MYERS JR.,SAMUEL M.; WRIGHT,ALAN F.; PETERSEN,GARY A.; SEAGER,CARLETON H.; WAMPLER,WILLIAM R.; CRAWFORD,MARY H.; HAN,JUNG

    2000-04-17T23:59:59.000Z

    Formation energies and vibrational frequencies for H in wurtzite GaN were calculated from density functional theory and used to predict equilibrium state occupancies and solid solubilities for p-type, intrinsic, and n-type material. The solubility of deuterium (D) was measured at 600--800 C as a function of D{sub 2} pressure and doping and compared with theory. Agreement was obtained by reducing the H formation energies 0.2 eV from ab-initio theoretical values. The predicted stretch-mode frequency for H bound to the Mg acceptor lies 5% above an observed infrared absorption attributed to this complex. It is concluded that currently recognized H states and physical processes account for the equilibrium behavior of H examined in this work.

  12. Diffusion, Uptake and Release of Hydrogen in p-type Gallium Nitride: Theory and Experiment

    SciTech Connect (OSTI)

    MYERS JR.,SAMUEL M.; WRIGHT,ALAN F.; PETERSEN,GARY A.; WAMPLER,WILLIAM R.; SEAGER,CARLETON H.; CRAWFORD,MARY H.; HAN,JUNG

    2000-06-27T23:59:59.000Z

    The diffusion, uptake, and release of H in p-type GaN are modeled employing state energies from density-function theory and compared with measurements of deuterium uptake and release using nuclear-reaction analysis. Good semiquantitative agreement is found when account is taken of a surface permeation barrier.

  13. SAGE: Solar Neutrino Data from SAGE, the Russian-American Gallium Solar Neutrino Experiment

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    SAGE Collaboration

    SAGE is a solar neutrino experiment based on the reaction 71Ga + n goes to 71Ge + e-. The 71Ge atoms are chemically extracted from a 50-metric ton target of Ga metal and concentrated in a sample of germane gas mixed with xenon. The atoms are then individually counted by observing their decay back to 71Ga in a small proportional counter. The distinguishing feature of the experiment is its ability to detect the low-energy neutrinos from proton-proton fusion. These neutrinos, which are made in the primary reaction that provides the Sun's energy, are the major component of the solar neutrino flux and have not been observed in any other way. To shield the experiment from cosmic rays, it is located deep underground in a specially built facility at the Baksan Neutrino Observatory in the northern Caucasus mountains of Russia. Nearly 100 measurements of the solar neutrino flux have been made during 1990-2000, and their combined result is a neutrino capture rate that is well below the prediction of the Standard Solar Model. The significant suppression of the solar neutrino flux that SAGE and other solar neutrino experiments have observed gives a strong indication for the existence of neutrino oscillations. [copied from the SAGE homepage at http://ewi.npl.washington.edu/SAGE/SAGE.html

  14. Synthesis and optical properties of CsC1-doped gallium-sodium-sulfide glasses

    SciTech Connect (OSTI)

    Hehlen, Markus P [Los Alamos National Laboratory; Bennett, Bryan L [Los Alamos National Laboratory; Williams, Darrick J [Los Alamos National Laboratory; Muenchausen, Ross E [Los Alamos National Laboratory; Castro, Alonso [Los Alamos National Laboratory; Tornga, Stephanie C [Los Alamos National Laboratory

    2009-01-01T23:59:59.000Z

    Ga{sub 2}S{sub 3}-Na{sub 2}S (GNS) glasses doped with CsCl were synthesized in open crucibles under inert atmosphere. The evaporative loss of CsCl during glass melting was measured by energy dispersive X-ray spectroscopy and corrected for by biasing the CsCl concentration in the mixture of starting materials to obtain glasses with accurately controlled stoichiometry. Glass transition temperatures, refractive index dispersions, and band edge energies were measured for four GNS:CsCl glasses, and the respective values were found to significantly improve over earlier studies that did not mitigate CsCl evaporative losses. The refractive index dispersion measurements indicate that the Cs{sup +} and Cl{sup -} radii are 16% larger in GNS:CsCl glass than in bulk crystalline CsCl. The band edge energy increases from 2.97 eV in GNS glass to 3.32 eV in GNS glass doped with 20 mol% CsCl as a result of introducing Cl{sup -} ions having a large optical electronegativity. The large bandgap of 3.32 eV and the low (450 cm{sup -1}) phonon energy make GNS:20%CsCl an attractive host material for rare-earth ions with radiative transitions in the near ultra-violet, visible, and near-infrared spectral regions.

  15. The marine geochemistry of dissolved gallium: A comparison with dissolved aluminum

    SciTech Connect (OSTI)

    Orians, K.J.; Bruland, K.W. (Univ. of California, Santa Cruz (USA))

    1988-12-01T23:59:59.000Z

    Dissolved Ga concentrations in the pacific Ocean range from 2 to 30 picomolar: they are low in surface waters (2-12 pM), with a subsurface maximum at 150-300 m (6-17 pM), a mid-depth minimum from 500 to 1,000 m (4-10 pM) and increasing values with depth to a maximum in the bottom waters (12-30 pM). The highest concentrations are in the central gyre, with lower values toward the north and east where productivity and particle scavenging increase. Dissolved Ga concentrations in the surface waters of the northwest Atlantic are nearly an order of magnitude higher than in the central North pacific, with higher values in the Gulf Stream than in the continental slope boundary region. The vertical distributions and horizontal transects indicate three sources of dissolved Ga to the oceans. The surface distribution reflects an eolian source with no net fluvial input to the open ocean; the subsurface maximum (a feature not seen for North Pacific dissolved Al) is attributed to vertical exchange processes; the source for the deep waters of the North Pacific is from a sediment surface remineralization process or a pore water flux. Scavenging removal throughout the water column is evident in the vertical profiles for both dissolved Ga and Al, with intensified removal in the boundary regions where productivity and particle scavenging are at a maximum. Residence times of dissolved Ga in surface waters are nearly an order of magnitude longer than the corresponding values for Al.

  16. Tungsten-incorporation induced red-shift in the bandgap of gallium oxide thin films

    SciTech Connect (OSTI)

    Rubio, E. J.; Ramana, C. V. [Department of Mechanical Engineering, University of Texas at El Paso, El Paso, Texas 79968 (United States)] [Department of Mechanical Engineering, University of Texas at El Paso, El Paso, Texas 79968 (United States)

    2013-05-13T23:59:59.000Z

    Tungsten (W) incorporated Ga{sub 2}O{sub 3} films were produced by co-sputter deposition. W-concentration was varied by the applied sputtering-power. The structure and optical properties of W-incorporated Ga{sub 2}O{sub 3} films were evaluated using X-ray diffraction, scanning electron microscopy, and spectrophotometric measurements. No secondary phase formation was observed in W-incorporated Ga{sub 2}O{sub 3} films. W-induced effects were significant on the structure and optical properties of Ga{sub 2}O{sub 3} films. The bandgap of Ga{sub 2}O{sub 3} films without W-incorporation was {approx}5 eV. Red-shift in the bandgap was noted with increasing W-concentration indicating the electronic structure changes in W-Ga{sub 2}O{sub 3} films. A functional relationship between W-concentration and optical property is discussed.

  17. The determination of titanium, germanium and gallium by charged particle activation analysis

    E-Print Network [OSTI]

    Novak, Leo Robert

    1975-01-01T23:59:59.000Z

    . 3 hz 0. 559 3. 008 -13. 540 5. 143 2. 859 -11. 529 9. 0 x 10 5 1. 10 x 10 5 9. 31 x 10 5 1. 35 x 10 5 1. 17 x 10 5 70 69 Ge (p, pn) Ge 74 11 se(p, o) As 76 72 Se(p, an) As -11. 529 ' 0. 545 10. 245 a) dps per NA for 1 minute.... 85 x 10 74 Se(d, nn) As 71 1. 680 Ge(6, 2n) As 72 26. 0 hr . 834 7. 367 2. 86 x 10 746 (0 ) 72A 6. 718 "Ge(d. n) ' As Ge (d, 2n) As 17. 76 d . 596 6. 176 - 5. 570 2. 72 x 10 As(d, dn) As -10. 248 a) dps per VA for 1 minute irradietions, natural...

  18. Electrical properties of TiN on gallium nitride grown using different deposition conditions and annealing

    SciTech Connect (OSTI)

    Li, Liuan; Kishi, Akinori; Shiraishi, Takayuki; Jiang, Ying; Wang, Qingpeng; Ao, Jin-Ping, E-mail: jpao@ee.tokushima-u.ac.jp [Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506 (Japan)

    2014-03-15T23:59:59.000Z

    This study evaluates the thermal stability of different refractory metal nitrides used as Schottky electrodes on GaN. The results demonstrate that TiN, MoSiN, and MoN possess good rectification and adhesion strength, with barrier heights of 0.56, 0.54, and 0.36?eV, respectively. After thermal treatment at 850?°C for 1?min, the TiN and MoN electrodes still exhibit rectifying characteristics, while the MoSiN degrades to an ohmic-like contact. For further study, several TiN films are deposited using different N{sub 2}/Ar reactive/inert sputtering gas ratios, thereby varying the nitrogen content present in the sputtering gas. Ohmic-like contact is observed with the pure Ti contact film, and Schottky characteristics are observed with the samples possessing nitrogen in the film. The average Schottky barrier height is about 0.5?eV and remains virtually constant with varying nitrogen deposition content. After examining Raman spectra and x-ray photoelectron spectroscopy results, the increase in the film resistivity after thermal treatment is attributed to oxidation and/or nitridation. Films deposited with a medium (40% and 60%) nitrogen content show the best film quality and thermal stability.

  19. Gallium-68 Bioorthogonal Tetrazine Polymers for the Multistep Labeling of Cancer Biomarkers /

    E-Print Network [OSTI]

    Nichols, Brandon Edward

    2013-01-01T23:59:59.000Z

    68 somatostatin receptor PET/CT: is it time to replace (111)mapping of the prostate using PET/CT fusion imaging and Ga-

  20. amorphous indium-gallium-zinc oxide: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Summary: alloy of composition correspond- ing to the metallic components of the superconduct- ing oxides respectivement. Abstract. - Previous quenching experiments on 2212...

  1. Radiation-Hardened Gallium Nitride Detector and Arrays for Fusion Diagnostics

    SciTech Connect (OSTI)

    Sun, K. X., and MacNeil, L.

    2011-09-08T23:59:59.000Z

    This poster reports testing to confirm that GaN devices exhibit the extreme radiation hardness needed for use at the NIF, functioning properly after 1x10{sup 12} protons/cm{sup 2} proton irradiation in one year.

  2. High Quality, Low Cost Bulk Gallium Nitride Substrates Grown by the Electrochemical Solution Growth Method

    Broader source: Energy.gov (indexed) [DOE]

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645 3,625 1,006 492 742Energy ChinaofSchaefer To:Department of EnergySeacrist, Senior Fellow - Emerging Technologies

  3. High-Quality, Low-Cost Bulk Gallium Nitride Substrates | Department of

    Broader source: Energy.gov (indexed) [DOE]

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645 3,625 1,006 492 742Energy ChinaofSchaefer To:Department of EnergySeacrist, SeniorVolume 6 Building

  4. Sandia Energy - BES Web Highlight: Single-mode gallium nitride nanowire

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level:Energy: Grid Integration Redefining What's PossibleRadiation Protection245C Unlimited ReleaseWelcome ton6Andy

  5. Gallium Safety in the Laboratory INEEL/CON-03-00078

    Office of Scientific and Technical Information (OSTI)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645 3,625 1,006 492 742EnergyOnItem Not Found Item Not Found The itemAIR57451DOE/SC0002390dV DOE/m/10412 - 6 PROGWM:This

  6. P-T phase diagram of iron arsenide superconductor NdFeAsO0.88F0.12

    E-Print Network [OSTI]

    Lin, Jung-Fu "Afu"

    the EPL website to read the latest articles published in cutting-edge fields of research from across of the referees to making all final acceptance decisions Impact Factor ­ The 2010 Impact Factor is 2.753; your Journal Citation Reports IMPACT FACTOR 500 000full text downloads in 2010 OVER 30 DAYS 16 961 average

  7. Production data on 0.55 eV InGaAs thermophotovoltaic cells

    SciTech Connect (OSTI)

    Wojtzuk, S.; Colter, P. [Spire Corp., Bedford, MA (United States); Charache, G.; Campbell, B. [Lockheed Martin, Inc., Schenectady, NY (United States)

    1996-05-01T23:59:59.000Z

    Low bandgap 0.55 eV (2.25 {micro}m cutoff wavelength) indium gallium arsenide (In{sub 0.72}Ga{sub 0.28}As) thermophotovoltaic (TPV) cells use much more of the long wavelength energy emitted from low temperature (< 1,200 C) thermal sources than either Si or GaSb cells. Data are presented on a statistically significant number (2,500) of these TPV cells, indicating the performance obtainable in large numbers of cells. This data should be useful in the design and modeling of TPV system performance. At 1.2 A/cm{sup 2} short-circuit current, an average open-circuit voltage of 283 mV is obtained with a 60% fill factor. The peak external quantum efficiency for uncoated cells is 65% and is over 50% from 1.1 to 2.2 {micro}m. Internal quantum efficiency is over 76% in this range assuming an estimated 34% reflectance loss.

  8. Updated Results of a Solid-State Sensor Irradiation Study for ILC Extreme Forward Calorimetry

    E-Print Network [OSTI]

    Courcoubetis, George; Fadeyev, Vitaliy; Kelley, Thomas; Martinez-McKinney, Forest; Schumm, Bruce A; Spencer, Edwin; Tang, Vivian; Wilder, Max

    2015-01-01T23:59:59.000Z

    Detectors proposed for the International Linear Collider (ILC) incorporate a tungsten sampling calorimeter (`BeamCal') intended to reconstruct showers of electrons, positrons and photons that emerge from the interaction point of the collider with angles between 5 and 50 milliradians. For the innermost radius of this calorimeter, radiation doses at shower-max are expected to reach 100 MRad per year, primarily due to minimum-ionizing electrons and positrons that arise in the induced electromagnetic showers of e+e- `beamstrahlung' pairs produced in the ILC beam-beam interaction. However, radiation damage to calorimeter sensors may be dominated by hadrons induced by nuclear interactions of shower photons, which are much more likely to contribute to the non-ionizing energy loss that has been observed to damage sensors exposed to hadronic radiation. We report here on the results of SLAC Experiment T-506, for which several different types of silicon diode and gallium-arsenide sensors were exposed to doses of radiati...

  9. Photovoltaics: From the laboratory to the marketplace

    SciTech Connect (OSTI)

    Basso, T.S.; Surek, T.; Thornton, J.

    1991-03-01T23:59:59.000Z

    Photovoltaics (PV), the direct conversion of sunlight to electricity, is experiencing significant improvements in technology performance and lowered costs. Fostering these improvements, the SERI Photovoltaic Advanced Research and Development (PV AR D) Project supports research and provides services to the US PV industry. This paper presents the recent advances and future direction of the PV project. Research areas are Fundamental and Supporting Research, Advanced Thin-Film Materials, High-Efficiency Materials, Module Development, and Systems Development. Materials of interest include amorphous silicon, copper indium diselenide, cadmium telluride, crystalline silicon, gallium arsenide and related alloys, transparent conductors, antireflection coatings, substrates, and encapsulants. The PV project inherently provides technology transfer that helps industry shorten the time to bring R D advances to the marketplace. SERI annually performs over 10,000 measurements for the entire PV community, participates in collaborative research, and welcomes visiting scientists. Two specific areas of recently increased national focus are: (1) manufacturing processes for cost-effective PV modules, and (2) systems development for high-value utility applications. The SERI research approach is based on facilitating direct contact between industry, electric utilities, and others interested in PV technology. This approach heavily relies on SERI/industry partnerships. The arrangements vary to address generic and company-specific problems to improve the US industry's competitive position and accelerate greater electric utility deployment of PV systems. 5 refs., 5 figs., 6 tabs.

  10. Ultra-low threshold, electrically pumped quantum dot photonic crystal nanocavity laser

    E-Print Network [OSTI]

    Bryan Ellis; Marie Mayer; Gary Shambat; Tomas Sarmiento; James Harris; Eugene Haller; Jelena Vuckovic

    2011-05-02T23:59:59.000Z

    Efficient, low threshold, and compact semiconductor laser sources are being investigated for many applications in high-speed communications, information processing, and optical interconnects. The best edge-emitting and vertical cavity surface-emitting lasers (VCSELs) have thresholds on the order of 100 \\muA[1,2] but dissipate too much power to be practical for many applications, particularly optical interconnects[3]. Optically pumped photonic crystal (PC) nanocavity lasers represent the state of the art in low-threshold lasers[4,5]; however, in order to be practical, techniques to electrically pump these structures must be developed. Here we demonstrate a quantum dot photonic crystal nanocavity laser in gallium arsenide pumped by a lateral p-i-n junction formed by ion implantation. Continuous wave lasing is observed at temperatures up to 150 K. Thresholds of only 181 nA at 50 K and 287 nA at 150 K are observed - the lowest thresholds ever observed in any type of electrically pumped laser.

  11. Ultrafast gating of proximity-focused microchannel-plate intensifiers

    SciTech Connect (OSTI)

    Lundy, A.S.; Iverson, A.E.

    1982-01-01T23:59:59.000Z

    Proximity-focused, microchannel-plate (MCP) image intensifiers have been used at Los Alamos for many years to allow single frame film and video exposure times in the range of 2.5 to 10 ns. There is now a program to reduce gating times to < 1 ns. This paper reviews previous work and the problems in achieving good resolution with gating times of < 1 ns. The key problems involve applying fast electrical gating signals to the tube elements. We present computer modeling studies of the combined tube, tube connection, and pulser system and show that low photocathode surface resistivity must be obtained to permit fast gating between the photocathode and the MCP input. We discuss ways of making low-resistivity S20 photocathodes, using gallium arsenide photocathodes, and various means of gating the tubes. A variety of pulser designs are being experimentally evaluated including spark gaps, avalanche transistors, Krytron tubes with sharpening gaps, step recovery diodes, and photoconductive elements (PCEs). The results of these studies are presented. Because of the high capacitances involved in most gating schemes, the tube connection geometry must be of low-impedance design, and our solution is presented. Finally, ways of testing these high-speed camera systems are discussed.

  12. NREL photovoltaic subcontract reports: Abstracts and document control information, 1 August 1992--31 July 1993

    SciTech Connect (OSTI)

    Not Available

    1993-09-01T23:59:59.000Z

    This report contains document control information and abstracts for the National Renewable Energy Laboratory (NREL) subcontracted photovoltaic (PV) program publications. It also lists source information on additional publications that describe US Department of Energy (DOE) PV research activities. It is not totally exhaustive, so it lists NREL contacts for requesting further information on the DOE and NREL PV programs. This report covers the period from August 1, 1992, through July 31, 1993. This report is published periodically, with the previous one covering the period from August 1, 1991, through July 31, 1992. The purpose of continuing this type of publication is to help keep people abreast of specific PV interests, while maintaining a balance on the costs to the PV program. The information in this report is organized under PV technology areas: Amorphous Silicon Research; Polycrystalline Thin Films (including copper indium diselenide, cadmium telluride, and thin-film silicon); Crystalline Materials and Advanced Concepts (including silicon, gallium arsenide, and other group III-V materials); PV Manufacturing Technology Development (which may include manufacturing information for various types of PV materials).

  13. Estimates of occupational safety and health impacts resulting from large-scale production of major photovoltaic technologies

    SciTech Connect (OSTI)

    Owens, T.; Ungers, L.; Briggs, T.

    1980-08-01T23:59:59.000Z

    The purpose of this study is to estimate both quantitatively and qualitatively, the worker and societal risks attributable to four photovoltaic cell (solar cell) production processes. Quantitative risk values were determined by use of statistics from the California semiconductor industry. The qualitative risk assessment was performed using a variety of both governmental and private sources of data. The occupational health statistics derived from the semiconductor industry were used to predict injury and fatality levels associated with photovoltaic cell manufacturing. The use of these statistics to characterize the two silicon processes described herein is defensible from the standpoint that many of the same process steps and materials are used in both the semiconductor and photovoltaic industries. These health statistics are less applicable to the gallium arsenide and cadmium sulfide manufacturing processes, primarily because of differences in the materials utilized. Although such differences tend to discourage any absolute comparisons among the four photovoltaic cell production processes, certain relative comparisons are warranted. To facilitate a risk comparison of the four processes, the number and severity of process-related chemical hazards were assessed. This qualitative hazard assessment addresses both the relative toxicity and the exposure potential of substances in the workplace. In addition to the worker-related hazards, estimates of process-related emissions and wastes are also provided.

  14. Excitation-Dependent Recombination and Diffusion Near an Isolated Dislocation in GaAs

    SciTech Connect (OSTI)

    Gfroerer, T. H.; Crowley, C. M.; Read, C. M.; Wanlass, M. W.

    2012-06-01T23:59:59.000Z

    In low-magnification, plan-view photoluminescence images of a nominally lattice-matched, undoped GaAs/GaInP heterostructure, we observe a random distribution of isolated dark spots. We attribute the dark spots to crystal dislocations, where nonradiative recombination is augmented by transitions utilizing defect-related energy levels between the conduction and valence bands. We note that, when the laser excitation intensity is reduced, the darkened regions expand. At lower excitation, the density of photogenerated electrons and holes is reduced, and they are more likely to reach the defective region before encountering a partner for radiative recombination. When we model the behavior with a simulation that allows for Laplacian diffusion and defect-related recombination only through mid-bandgap energy levels, we do not obtain good agreement between experimental and simulated images. But if we allow for an arbitrary distribution of defect levels, such that the occupation of the levels and bands can change independently, we have more flexibility for fitting the density-dependent recombination rates. The more sophisticated model produces results that are more consistent with experimental images.

  15. Antimonide-Based Long-Wavelength Lasers on GaAs Substrates

    SciTech Connect (OSTI)

    KLEM,JOHN F.; Blum, O.

    2000-08-17T23:59:59.000Z

    We have investigated the use of GaAsSb in edge-emitting laser active regions, in order to obtain lasing near 1.3 {micro}m. Single quantum well GaAsSb devices display electroluminescence at wavelengths as long as 1.34 {micro}m, but substantial blueshifts occur under high injection conditions. GaAsSb single quantum well edge emitters have been obtained which lase at 1.275 {micro}m with a room-temperature threshold current density as low as 535 A/cm{sup 2}. Modification of the basic GaAsSb/GaAs structure with the addition of InGaAs layers results in a strongly type-II band alignment which can be used to further extend the emission wavelength of these devices. Using GaAsSb/InGaAs active regions, lasers emitting at 1.17 {micro}m have been obtained with room-temperature threshold current densities of 120 A/cm{sup 2}, and devices operating at 1.29 {micro}m have displayed thresholds as low as 375 A/cm{sup 2}. Characteristic temperatures for devices employing various GaAsSb-based active regions have been measured to be 60-73 K.

  16. E-Print Network 3.0 - adsorbate covered gaas1 Sample Search Results

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ; Physics ; Materials Science 82 Terahertz Time-Domain Spectroscopy Study of Silica Aerogels and Adsorbed Molecular Jiangquan Zhang and D. Grischkowsky* Summary: that the...

  17. Magnetostructure of MnAs on GaAs revisited E. Bauer,1,2

    E-Print Network [OSTI]

    Paris-Sud XI, Université de

    introduced a model in which the crystal changed from a high spin state in the phase to a low spin state change during the phase transition is connected with a change of the sign of the exchange constant via material. hal-00193844,version1-4Dec2007 #12;3 FIG. 1. Structure of MnAs. (a) Hexagonal phase (NiAs type

  18. Recent improvements in materials for thin GaAs and multibandgap solar cells

    SciTech Connect (OSTI)

    Benner, J.P.

    1985-05-01T23:59:59.000Z

    The High Efficiency Concepts Program at SERI supports research on III-V compound semiconductors with the objective of achieving the maximum attainable photovoltaic conversion efficiencies for terrestrial solar electric power. The outcome of this research may also affect the future of space photovoltaic cells. While the interest in thin-film, high-efficiency solar cells for terrestrial applications is driven principally by consideration of system costs, such cells would also improve the power density of space power arrays.

  19. Superluminescent damping of relaxation resonance in the modulation response of GaAs lasers

    SciTech Connect (OSTI)

    Lau, K.Y.; Ury, I.; Bar-Chaim, N.; Harder, C.; Yariv, A.

    1983-08-15T23:59:59.000Z

    It is demonstrated experimentally that the intrinsic modulation response of injection lasers can be modified by reducing mirror reflectivities, which leads to suppression of relaxation oscillation resonance and a reduction of nonlinear distortions up to multi-GHz frequencies. A totally flat response with a 3-dB bandwidth of 5 GHz was obtained using antireflection coated buried heterostructure lasers fabricated on a semi-insulating substrate. Harmonic distortions were below 40 dB within the entire 3-dB bandwidth. These results are in accord with theoretical predictions based on an analysis which include the effects of superluminescence in the laser cavity.

  20. Longitudinal mode spectrum of GaAs injection lasers under high-frequency microwave modulation

    SciTech Connect (OSTI)

    Lau, K.Y.; Harder, C.; Yariv, A.

    1983-10-01T23:59:59.000Z

    Experimental observations of the lasing spectrum of a single mode semiconductor laser under continuous microwave modulation reveal that the lasing spectrum is apparently locked to a single longitudinal mode for optical modulation depths up to approx.80%, beyond which the lasing spectrum becomes multimoded, whose envelope width increases very rapidly with further increase in modulation depth. These results are satisfactorily explained by a theoretical treatment which enables one to predict the dynamic lasing spectrum of a laser from its cw lasing spectra at various output powers.

  1. Carbon-doped GaAs single junction solar microcells grown in multilayer epitaxial assemblies

    E-Print Network [OSTI]

    Li, Xiuling

    for the degraded contact properties and photovoltaic performance, resulting from prolonged thermal treatmentsAs solar cells,6 however, the photovoltaic performance showed a systematic degradation betwe of photovoltaic performance compared to zinc-doped systems due to the lack of mobile dopants while a slight

  2. Carbon-doped GaAs single junction solar microcells grown in multilayer epitaxial assemblies

    E-Print Network [OSTI]

    Rogers, John A.

    responsible for the degraded contact properties and photovoltaic performance, resulting from prolonged thermalAs solar cells,6 however, the photovoltaic performance showed a systematic degradation between device uniformity of photovoltaic performance compared to zinc-doped systems due to the lack of mobile dopants while

  3. The design of GaAs HEMT and HBT Bessel-type transimpedance amplifiers

    E-Print Network [OSTI]

    Adeyemi, Oluwafemi Ibukunoluwa

    2007-04-25T23:59:59.000Z

    chips at low cost, using relatively cheap semiconductor processes. The optical preamplifier (transimpedance amplifier) receives optical information and converts it to a useful electrical form. It must operate at high speed, contribute little distortion...

  4. activated si-gaas high-voltage: Topics by E-print Network

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Summary: ??This thesis is concerned with developing a new approach to high voltage transformers condition monitoring, which involve partial discharge (PD) measurement and...

  5. Non-Collinear Paramagnetism of a GaAs Two-Dimensional Hole System

    E-Print Network [OSTI]

    Yeoh, L. A.; Srinivasan, A.; Klochan, O.; Winkler, R.; Zülicke, U.; Simmons, M. Y.; Ritchie, D. A.; Pepper, M.; Hamilton, A. R.

    2014-12-03T23:59:59.000Z

    to manipulate the perpen- dicular spin polarization without coupling to the orbital momentum, paving the way for more detailed studies and applications of non-collinear magnetic responses in low- dimensional hole systems. We thank A. Edgar, T. Li, O. P. Sushkov...

  6. Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions

    E-Print Network [OSTI]

    Hisaka, Takayuki

    We have comprehensively investigated the degradation mechanism of AlGaAs/InGaAs pseudomorphic high-electron-mobility transistors (PHEMTs) under operation in high humidity conditions. PHEMTs degradation under high humidity ...

  7. Modifications du travail de sortie des surfaces clives de GaAs, lies au refroidissement

    E-Print Network [OSTI]

    Boyer, Edmond

    les positions energetiques des etats de surface. Cette idee a ete reprise et developpee par L. K experimentaux ne posent pas de probleme majeur [6], 1'exp6rimentation, delicate, conduit a se poser la question

  8. Fourier spectroscopy of individual nitrogen impurity centers in GaAs

    SciTech Connect (OSTI)

    Ikezawa, Michio [PRESTO-JST, JST, Kawaguchi, Japan and Institute of Physics, University of Tsukuba, Tsukuba (Japan); Zhang, Liao; Mori, Tatsuya; Masumoto, Yasuaki [Institute of Physics, University of Tsukuba, Tsukuba (Japan); Sakuma, Yoshiki; Sakoda, Kazuaki [National Institute for Materials Science, Tsukuba (Japan)

    2013-12-04T23:59:59.000Z

    We report on the measurement of the exciton homogeneous linewidth in nitrogen impurity centers in GaAs:N. Fourier spectroscopy on a single center revealed a long coherence time over 300 ps at low temperature. The narrowest linewidth obtained at liquid helium temperature is 3.5 ?eV, which is comparable with that of semiconductor quantum dots. The linewidth increases with increasing temperature, showing a thermally activated behavior with activation energies of 2?5 meV.

  9. Free carrier induced spectral shift for GaAs filled metallic hole arrays

    E-Print Network [OSTI]

    New Mexico, University of

    References and links 1. J. M. Luther, P. K. I. Jain, T. Ewers, and A. P. Alivisatos, "Localized surface

  10. Double Power Output for GaAs Solar Cells Embedded in Luminescent Waveguides

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AFDC Printable Version Share this resource Send a link to EERE: Alternative Fuels Data Center Home Page to someone by E-mail Share EERE: Alternative Fuels Data Center Home Page on Facebook Tweet about EERE: Alternative Fuels Data Center Home Page on Twitter Bookmark EERE: Alternative1 First Use of Energy for All Purposes (Fuel and Nonfuel), 2002; Level: National5Sales for4,645 3,625govInstrumentstdmadapInactiveVisitingContract ManagementDiscovering HowAna Moore Anne Jones DevensforDouble

  11. High Efficiency Nanostructured III-V Photovoltaics for Solar Concentrator Application

    SciTech Connect (OSTI)

    Hubbard, Seth

    2012-09-12T23:59:59.000Z

    The High Efficiency Nanostructured III-V Photovoltaics for Solar Concentrators project seeks to provide new photovoltaic cells for Concentrator Photovoltaics (CPV) Systems with higher cell efficiency, more favorable temperature coefficients and less sensitivity to changes in spectral distribution. The main objective of this project is to provide high efficiency III-V solar cells that will reduce the overall cost per Watt for power generation using CPV systems.This work is focused both on a potential near term application, namely the use of indium arsenide (InAs) QDs to spectrally "tune" the middle (GaAs) cell of a SOA triple junction device to a more favorable effective bandgap, as well as the long term goal of demonstrating intermediate band solar cell effects. The QDs are confined within a high electric field i-region of a standard GaAs solar cell. The extended absorption spectrum (and thus enhanced short circuit current) of the QD solar cell results from the increase in the sub GaAs bandgap spectral response that is achievable as quantum dot layers are introduced into the i-region. We have grown InAs quantum dots by OMVPE technique and optimized the QD growth conditions. Arrays of up to 40 layers of strain balanced quantum dots have been experimentally demonstrated with good material quality, low residual stain and high PL intensity. Quantum dot enhanced solar cells were grown and tested under simulated one sun AM1.5 conditions. Concentrator solar cells have been grown and fabricated with 5-40 layers of QDs. Testing of these devices show the QD cells have improved efficiency compared to baseline devices without QDs. Device modeling and measurement of thermal properties were performed using Crosslight APSYS. Improvements in a triple junction solar cell with the insertion of QDs into the middle current limiting junction was shown to be as high as 29% under one sun illumination for a 10 layer stack QD enhanced triple junction solar cell. QD devices have strong potential for net gains in efficiency at high concentration.

  12. The radiation bio-effects of gallum-72 on leukemic cells via a gallium-transferrin complex

    E-Print Network [OSTI]

    Forbes, Christen Douglas

    1999-01-01T23:59:59.000Z

    Improved methods for treatment of leukemia would be advantageous for patients and the medical community. This thesis reports results of a study of the cytotoxicity of radiolabeled transferrin in cultured leukemic cells. K-562 cells, from...

  13. DESIGN AND ANALYSIS OF AN INTEGRATED PULSE MODULATED S-BAND POWER AMPLIFIER IN GALLIUM NITRIDE PROCESS

    SciTech Connect (OSTI)

    STEVE SEDLOCK

    2012-04-04T23:59:59.000Z

    The design of power amplifiers in any semi-conductor process is not a trivia exercise and it is often encountered that the simulated solution is qualitatively different than the results obtained. Phenomena such as oscillation occurring either in-band or out of band and sometimes at subharmonic intervals, continuous spectrum noticed in some frequency bands, often referred to as chaos, and jumps and hysteresis effects can all be encountered and render a design useless. All of these problems might have been identified through a more rigorous approach to stability analysis. Designing for stability is probably the one area of amplifier design that receives the least amount of attention but incurs the most catastrophic of effects if it is not performed properly. Other parameters such as gain, power output, frequency response and even matching may suitable mitigation paths. But the lack of stability in an amplifier has no mitigating path. In addition to of loss of the design completely there are the increased production cycle costs, costs involved with investigating and resolving the problem and the costs involved with schedule slips or delays resulting from it. The Linville or Rollett stability criteria that many microwave engineers follow and rely exclusively on is not sufficient by itself to ensure a stable and robust design. It will be shown that the universal belief that unconditional stability is obtained through an analysis of the scattering matrix S to determine if 1 and |{Delta}{sub S}| < 1 is only part of the procedure and other tools must be used to validate the criteria. The research shown contributes to the state of the art by developing a more thorough stability design technique for designing amplifiers of any class, whether that be current mode or switch mode, than is currently undertaken with the goal of obtaining first pass design success.

  14. The design, construction, and testing of a nuclear fuel rod thermal simulation system to study gallium/Zircaloy interactions 

    E-Print Network [OSTI]

    Allison, Christopher Curtis

    1999-01-01T23:59:59.000Z

    ) fuel rods. The system uses electrically heated simulated fuel rods inside of a large, natural convection heat exchanger that uses lead-bismuth eutectic (LBE) (45 fluid. The simulated rods consist of small diameter...

  15. The overexpression of NADPH-producing enzymes counters the oxidative stress evoked by gallium, an iron mimetic

    E-Print Network [OSTI]

    Appanna, Vasu

    ), an iron (Fe) mimetic promoted an oxidative environment and elicited an antioxidative response shown to result in unregu- lated ROS production (Huang 2003). For instance, the amyloid b-peptide

  16. Electrical and Optical Properties of Transparent Conducting Homologous Compounds in the IndiumGalliumZinc Oxide System

    E-Print Network [OSTI]

    Poeppelmeier, Kenneth R.

    , smart windows, and solar cells. Tin-doped indium oxide (ITO) is the commercial TCO of choice. ITO thin TRANSPARENT conducting oxides (TCOs) are used in a wide variety of applications, such as flat-panel displays, and lower cost are desired for use in demanding ap- plications such as next-generation flat-panel displays

  17. Precursors for formation of copper selenide, indium selenide, copper indium diselenide, and/or copper indium gallium diselenide films

    DOE Patents [OSTI]

    Curtis, Calvin J; Miedaner, Alexander; Van Hest, Maikel; Ginley, David S

    2014-11-04T23:59:59.000Z

    Liquid-based precursors for formation of Copper Selenide, Indium Selenide, Copper Indium Diselenide, and/or copper Indium Galium Diselenide include copper-organoselenides, particulate copper selenide suspensions, copper selenide ethylene diamine in liquid solvent, nanoparticulate indium selenide suspensions, and indium selenide ethylene diamine coordination compounds in solvent. These liquid-based precursors can be deposited in liquid form onto substrates and treated by rapid thermal processing to form crystalline copper selenide and indium selenide films.

  18. The influence of random indium alloy fluctuations in indium gallium nitride quantum wells on the device behavior

    SciTech Connect (OSTI)

    Yang, Tsung-Jui; Wu, Yuh-Renn, E-mail: yrwu@ntu.edu.tw [Graduate Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan (China); Shivaraman, Ravi; Speck, James S. [Department of Materials, University of California, Santa Barbara, California 93106 (United States)

    2014-09-21T23:59:59.000Z

    In this paper, we describe the influence of the intrinsic indium fluctuation in the InGaN quantum wells on the carrier transport, efficiency droop, and emission spectrum in GaN-based light emitting diodes (LEDs). Both real and randomly generated indium fluctuations were used in 3D simulations and compared to quantum wells with a uniform indium distribution. We found that without further hypothesis the simulations of electrical and optical properties in LEDs such as carrier transport, radiative and Auger recombination, and efficiency droop are greatly improved by considering natural nanoscale indium fluctuations.

  19. Investigation of Tunable Diode Spectroscopy for Monitoring Gases in Geothermal Plants

    SciTech Connect (OSTI)

    J. K. Partin

    2006-08-01T23:59:59.000Z

    The results of an investigation directed at the development of instrument-tation for the real-time monitoring of gases, such as hydrogen sulfide (H2S) and chloride (HCl), in geothermal process streams is described. The geothermal power industry has an interest in the development of new low maintenance techniques since improved capabilities could lead to considerable cost savings through the optimization of various gas abatement processes. Tunable diode laser spectroscopy was identified as a candidate tech-nology for this application and a commercial instrument was specified and procured for testing. The measurement principle involved the use of solid state diode lasers and frequency modulation techniques. The gallium arsenide diode lasers employed emit light in the 0.7 to 2.0 micron region of the electromagnetic spectrum. This region contains the overtone and combination absorption bands of a number of species of industrial interest, including H2S and HCl. A particular device can be tuned over a small range to match the absorption line by changing its applied temperature and current. The diode current can also be sinusoidally modulated in frequency as it is tuned across the line. This modulation allows measurements to be conducted at frequencies where the laser intensity noise is minimal; and therefore, very high signal-to-noise measurements are possible. The feasibility of using this technology in various types of geothermal process streams has been explored. The results of laboratory and field studies are presented along with new advances in laser technology that could allow more sensitive and selective measurements to be performed.

  20. Electrical and optical performance characteristics of 0.74eV p/n InGaAs monolithic interconnected modules

    SciTech Connect (OSTI)

    Wilt, D.M.; Weizer, V.G. [National Aeronautics and Space Administration, Cleveland, OH (United States). Lewis Research Center; Fatemi, N.S.; Jenkins, P.P.; Hoffman, R.W. Jr. [Essential Research Inc., Cleveland, OH (United States); Jain, R.K. [National Research Council, Washington, DC (United States); Murray, C.S.; Riley, D.R. [Westinghouse Electric Corp., West Mifflin, PA (United States)

    1997-06-01T23:59:59.000Z

    There has been a traditional trade-off in thermophotovoltaic (TPV) energy conversion development between system efficiency and power density. This trade-off originates from the use of front surface spectral controls such as selective emitters and various types of filters. A monolithic interconnected module (MIM) structure has been developed which allows for both high power densities and high system efficiencies. The MIM device consists of many individual indium gallium arsenide (InGaAs) cells series-connected on a single semi-insulating indium phosphide (InP) substrate. The MIM is exposed to the entire emitter output, thereby maximizing output power density. An infrared (IR) reflector placed on the rear surface of the substrate returns the unused portion of the emitter output spectrum back to the emitter for recycling, thereby providing for high system efficiencies. Initial MIM development has focused on a 1 cm{sup 2} device consisting of eight series interconnected cells. MIM devices, produced from 0.74 eV InGaAs, have demonstrated V{sub oc} = 3.2 volts, J{sub sc} = 70 mA/cm{sup 2} and a fill factor of 66% under flashlamp testing. Infrared (IR) reflectance measurements (> 2 {micro}m) of these devices indicate a reflectivity of > 82%. MIM devices produced from 0.55 eV InGaAs have also been demonstrated. In addition, conventional p/n InGaAs devices with record efficiencies (11.7% AM0) have been demonstrated.

  1. On the Mass Eigenstate Composition of the 8B Neutrinos from the Sun

    E-Print Network [OSTI]

    A. Kopylov; V. Petukhov

    2007-04-19T23:59:59.000Z

    The present data of gallium experiments provide indirectly the only experimental limit on the fraction of $\

  2. Occupational Medicine Implications of Engineered Nanoscale Particulate Matter

    E-Print Network [OSTI]

    Kelly, Richard J.

    2008-01-01T23:59:59.000Z

    Titanium Ytterbium Zirconium Animony Boron Carbon Cobalt Erbium Gallium Hafnium Iridium Lead Magnesium Neodymium Nitrogen

  3. Method for the chemical separation of GE-68 from its daughter Ga-68

    DOE Patents [OSTI]

    Fitzsimmons, Jonathan M.; Atcher, Robert W.

    2010-06-01T23:59:59.000Z

    The present invention is directed to a generator apparatus for separating a daughter gallium-68 radioisotope substantially free of impurities from a parent gernanium-68 radioisotope, including a first resin-containing column containing parent gernanium-68 radioisotope and daughter gallium-68 radioisotope, a source of first eluent connected to said first resin-containing column for separating daughter gallium-68 radioisotope from the first resin-containing column, said first eluent including citrate whereby the separated gallium is in the form of gallium citrate, a mixing space connected to said first resin-containing column for admixing a source of hydrochloric acid with said separated gallium citrate whereby gallium citrate is converted to gallium tetrachloride, a second resin-containing column for retention of gallium-68 tetrachloride, and, a source of second eluent connected to said second resin-containing column for eluting the daughter gallium-68 radioisotope from said second resin-containing column.

  4. Enhanced Performance of Small GaAs Solar Cells via Edge and Surface Passivation with Trioctylphosphine Sulfide

    E-Print Network [OSTI]

    Atwater, Harry

    % (absolute), even after a rinse in toluene to remove all but a few monolayers of TOP:S, confirming sidewall surfaces are passivated by heterojunction windows but whose edges are exposed. In very small cells, the larger fraction of exposed sidewall surface area causes an increase of recombination dark current

  5. Direct amplitude modulation of short-cavity GaAs lasers up to X-band frequencies

    SciTech Connect (OSTI)

    Lau, K.Y.; Bar-Chaim, N.; Ury, I.; Harder, C.; Yariv, A.

    1983-07-01T23:59:59.000Z

    Experimental and theoretical studies indicate that a high-frequency laser with bandwidths up to X-band frequencies (> or approx. =10 GHz) should be one having a short cavity with a window structure, and preferably operating at low temperatures. These designs would accomplish the task of shortening the photon lifetime, increasing the intrinsic optical gain, and increasing the internal photon density without inflicting mirror damage. A modulation bandwidth of >8 GHz has been achieved using a 120-..mu..m laser without any special window structure at room temperature.

  6. Fabrication of wideband optoelectronic differential amplifier using a balanced receiver on a semi-insulating GaAs substrate

    E-Print Network [OSTI]

    Choi, Kyoo Nam

    1989-01-01T23:59:59.000Z

    photocurrent flow- ing between the electrodes Iz, given by Is = (oE)WD = (qIr?nE)WD = (qnVs)WD I, = q( h )( L )=I ( L ) P~ p rE p rE (27) (26) 14 where I s is the primary photocurrent and E is the electric field inside the photocon- ductor. Also... of inductive(capacitive circuit elements and simulate overall output response. Design of Balanced Receiver It will be necessary to have two photo-conductive gaps, an output terminal pad and three pads to apply dual DC biases (positive, neutral, negative...

  7. Fabrication of wideband optoelectronic differential amplifier using a balanced receiver on a semi-insulating GaAs substrate 

    E-Print Network [OSTI]

    Choi, Kyoo Nam

    1989-01-01T23:59:59.000Z

    bandwidth. The monolithic receiver design described here has greatly reduced these undesirable effects and allowed multi-gigshertz performance. Balanced receivers have been fabricated with photoconductive gap widths of 5 pm and 3 Izrn... and supplies and to Jim Gardner for laser scribing and reticle fabrication support. I would especially like to thank Victor Swenson for his help in diagnosing and repairing the many equipment problems and instructions on equipment operation. I would also...

  8. Calculations of bound and resonant electronic states for the GaAs (111) (2x2) reconstructed surface

    E-Print Network [OSTI]

    Blount, Samuel Stephen

    1985-01-01T23:59:59.000Z

    ) l'or k = ]7. Plot of p]e, (k, E) for k = 18. 7'lot of p]?(k, E) for k = ]1). Plot of p]?(k, E) for k = 20. Plot of p], (k, E) for k = 21. Plot of p]?(k, E) for k = (0. 0000, 0, 0000), ? ]3eV. & E - ? Bel', 22 (0. 0000, 0, 0000), ? SeV & E.... 1426, 0. 0000), ? BeV. & E & ? 3e]~'. (0. 1426, 0. 0000), ? 3eV. & E - 2eV. 35 (0. 1784, 0, 0000), ? 13 e V. & E & ? Be V. . 37 (0. 1784, 0. 0000), ? SeV. & E & ? 3eV. . 38 (0. 1784, 0. 0000), ? 3eV. & E & 2eV. . . . 3g 22 Plot of p]?(k, E) for k...

  9. Hot-Electron Thermocouple and the Diffusion Thermopower of Two-Dimensional Electrons in GaAs

    E-Print Network [OSTI]

    Eisenstein, Jim

    of Technology, Pasadena, California 91125, USA 2 Sandia National Laboratories, Albuquerque, New Mexico 87185.1103/PhysRevLett.103.046807 PACS numbers: 73.50.Lw, 72.20.Pa, 73.63.Hs The thermoelectric properties of low. The resulting phonon wind exerts a drag force on the electron gas which leads to a thermoelectric voltage

  10. Effective masses for small nitrogen concentrations in InGaAsN alloys on GaAs

    SciTech Connect (OSTI)

    JONES,ERIC D.; ALLERMAN,ANDREW A.; KURTZ,STEVEN R.; FRITZ,IAN J.; MODINE,NORMAND A.; SIEG,ROBERT M.; BAJAJ,K.K.; TOZER,S.W.; WEI,X.

    2000-05-11T23:59:59.000Z

    The variation of the value of the linewidth of an excitonic transition in InGaAsN alloys (1% and 2% nitrogen) as a function of hydrostatic pressure using photoluminescence spectroscopy is studied at 4K. The excitonic linewidth increases as a function of pressure until about 100 kbar after which it tends to saturate. This pressure dependent excitonic linewidth is used to derive the pressure variation of the exciton reduced mass using a theoretical formalism based on the premise that the broadening of the excitonic transition is caused primarily by compositional fluctuations in a completely disordered alloy. The linewidth derived ambient pressure masses are compared and found to be in agreement with other mass measurements. The variation of this derived mass is compared with the results from a nearly first-principles approach in which calculations based on the local density approximation to the Kohn-Sham density functional theory are corrected using a small amount of experimental input.

  11. Effect of quantum dot position and background doping on the performance of quantum dot enhanced GaAs solar cells

    SciTech Connect (OSTI)

    Driscoll, Kristina, E-mail: kmdsps@rit.edu; Bennett, Mitchell F.; Polly, Stephen J.; Forbes, David V.; Hubbard, Seth M., E-mail: smhsps@rit.edu [NanoPower Research Laboratories, Rochester Institute of Technology, Rochester, New York (United States)

    2014-01-13T23:59:59.000Z

    The effect of the position of InAs quantum dots (QD) within the intrinsic region of pin-GaAs solar cells is reported. Simulations suggest placing the QDs in regions of reduced recombination enables a recovery of open-circuit voltage (V{sub OC}). Devices with the QDs placed in the center and near the doped regions of a pin-GaAs solar cell were experimentally investigated. While the V{sub OC} of the emitter-shifted device was degraded, the center and base-shifted devices exhibited V{sub OC} comparable to the baseline structure. This asymmetry is attributed to background doping which modifies the recombination profile and must be considered when optimizing QD placement.

  12. Perturbation of Au-assisted planar GaAs nanowire growth by p-type dopant impurities

    E-Print Network [OSTI]

    Li, Xiuling

    . Mårtensson, J. Trägårdh, C. Larsson, M. Rask, D. Hessman, L. Samuelson, and J. Ohlsson, "Monolithic GaAs/InGaP

  13. Epitaxial growth of Cu,,In,Ga...Se2 on GaAs,,110... and A. Rockett

    E-Print Network [OSTI]

    Rockett, Angus

    . INTRODUCTION The Cu(In, Ga)Se2 CIGS absorber layer in a recent record-efficiency CIGS solar cell1 has a 220.13 Commercially supplied ``epi-ready'' liquid- encapsulated Czo

  14. Growth Mechanism and Electronic Structure of Zn3P2 on the Ga-Rich GaAs(001) Surface

    E-Print Network [OSTI]

    Atwater, Harry

    as well as the potential for low-cost, thin-film fabrication make Zn3P2 a promising active material Zn3P2 films on III-V substrates unlocks a promising pathway toward high-efficiency, earth-abundant photovoltaic devices fabricated on reusable, single-crystal templates. The detailed chemical, structural

  15. Effects of gallium doping on properties of a-plane ZnO films on r-plane sapphire substrates by plasma-assisted molecular beam epitaxy

    SciTech Connect (OSTI)

    Han, Seok Kyu; Lee, Hyo Sung; Lim, Dong Seok; Hong, Soon-Ku; Yoon, Nara; Oh, Dong-Cheol; Ahn, Byung Jun; Song, Jung-Hoon; Yao, Takafumi [Department of Advanced Materials Engineering, Chungnam National University, Daejeon 305-764 (Korea, Republic of); Graduate School of Green Energy Technology, Chungnam National University, Daejeon 305-764 (Korea, Republic of); Department of Advanced Materials Engineering, Chungnam National University, Daejeon 305-764, Republic of Korea and Graduate School of Green Energy Technology, Chungnam National University, Daejeon 305-764 (Korea, Republic of); Center for Optoelectronic Materials and Devices, Department of Defense Science and Technology, Hoseo University, Cheonan 330-713 (Korea, Republic of); Department of Physics, Kongju National University, Gongju 314-701 (Korea, Republic of); Center for Interdisciplinary Research, Tohoku University, Sendai 980-8587 (Japan)

    2011-05-15T23:59:59.000Z

    The authors report on the structural, optical, and electrical properties of Ga-doped a-plane (1120) ZnO films grown by plasma-assisted molecular beam epitaxy. Ga doping level was controlled by changing the Ga cell temperatures from 350 to 470 deg. C with an interval of 30 deg. C. With up to Ga cell temperatures of 440 deg. C, single crystalline Ga-doped a-plane ZnO films were grown; however, the sample with a Ga cell temperature of 470 deg. C showed polycrystalline features. The typical striated surface morphology normally observed from undoped ZnO films disappeared with Ga doping. ZnO films doped with Ga cell temperatures up to 440 deg. C did not show a significant change in full width at half maximum (FWHM) values of (1120) x-ray rocking curves by doping. The smallest FWHM values were 0.433 deg. ({phi}=90 deg.) and 0.522 deg. ({phi}=0 deg. ) for the sample with a Ga cell temperature of 350 deg. C. The polycrystalline ZnO film with excessive Ga doping at the Ga cell temperature of 470 deg. C showed significantly increased FWHM values. Hall measurements at room temperature (RT) revealed that electron concentration began to be saturated at the Ga cell temperature of 440 deg. C and electron mobility was drastically reduced at the Ga cell temperature of 470 deg. C. The carrier concentration of Ga-doped ZnO films were controlled from 7.2x10{sup 18} to 3.6x10{sup 20} cm{sup -3}. Anisotropic electrical properties (carrier concentration and Hall mobility) were observed in measurements by the van der Pauw method depending on the direction (c- or m-direction) for the undoped sample but not observed for the doped samples. RT photoluminescence (PL) spectra from the Ga-doped single crystalline ZnO films showed dominant near band edge (NBE) emissions with negligibly deep level emission. The NBE intensity in PL spectra increases with Ga doping.

  16. Gallium Lighting, LLC, Accepts Inaugural Position on the Industry Advisory Board of UC-Light Center to Help Bring Wireless Data

    E-Print Network [OSTI]

    -Light Center to Help Bring Wireless Data Communications Capabilities to LED Lights Fayetteville, GA ­ February for their Energy Star rated products and produce some of the most energy efficient, environmentally friendly on the Industry Advisory Board for the Center for Ubiquitous Communication by Light (UC-Light Center) based

  17. Inversion by metalorganic chemical vapor deposition from N- to Ga-polar gallium nitride and its application to multiple quantum well light-emitting diodes

    SciTech Connect (OSTI)

    Hosalli, A. M.; Van Den Broeck, D. M.; Bedair, S. M. [Department of Electrical and Computer Engineering, NCSU, Raleigh, North Carolina 27695 (United States)] [Department of Electrical and Computer Engineering, NCSU, Raleigh, North Carolina 27695 (United States); Bharrat, D.; El-Masry, N. A. [Department of Material Science and Engineering, NCSU, Raleigh, North Carolina 27695 (United States)] [Department of Material Science and Engineering, NCSU, Raleigh, North Carolina 27695 (United States)

    2013-12-02T23:59:59.000Z

    We demonstrate a metalorganic chemical vapor deposition growth approach for inverting N-polar to Ga-polar GaN by using a thin inversion layer grown with high Mg flux. The introduction of this inversion layer allowed us to grow p-GaN films on N-polar GaN thin film. We have studied the dependence of hole concentration, surface morphology, and degree of polarity inversion for the inverted Ga-polar surface on the thickness of the inversion layer. We then use this approach to grow a light emitting diode structure which has the MQW active region grown on the advantageous N-polar surface and the p-layer grown on the inverted Ga-polar surface.

  18. J. Phys.: Condens. Matter 9 (1997) 95179525. Printed in the UK PII: S0953-8984(97)82806-8 An interatomic potential study of the properties of gallium

    E-Print Network [OSTI]

    Pandey, Ravi

    1997-01-01T23:59:59.000Z

    energies of intrinsic point defects reveal that vacancies are the dominant native defects in GaN. Lastly Gale Department of Physics, Michigan Technological University, Houghton, MI 49931, USA Department of Chemistry, Imperial College of Science, Technology and Medicine, South Kensington, London SW7 2AY, UK

  19. Gallium as a Possible Target Material for a Muon Collider or Neutrino Factory X. Ding, D. Cline, UCLA, Los Angeles, CA 90095, USA

    E-Print Network [OSTI]

    McDonald, Kirk

    .J. Weggel, Particle Beam Lasers, Inc., Northridge, CA 91324, USA V.B. Graves, ORNL, Oak Ridge, TN 37830, USA the peak for nickel), Liquid state at relatively low temperature (melting point = 29.8 C) , Potential plane at z = 50 m. For this analysis we select all pions and muons with 40

  20. Indium-Gallium Segregation in CuIn$_{x}$Ga$_{1-x}$Se$_2$: An ab initio based Monte Carlo Study

    E-Print Network [OSTI]

    Ludwig, Christian D R; Felser, Claudia; Schilling, Tanja; Windeln, Johannes; Kratzer, Peter

    2010-01-01T23:59:59.000Z

    Thin-film solar cells with CuIn$_x$Ga$_{1-x}$Se$_2$ (CIGS) absorber are still far below their efficiency limit, although lab cells reach already 19.9%. One important aspect is the homogeneity of the alloy. Large-scale simulations combining Monte Carlo and density functional calculations show that two phases coexist in thermal equilibrium below room temperature. Only at higher temperatures, CIGS becomes more and more a homogeneous alloy. A larger degree of inhomogeneity for Ga-rich CIGS persists over a wide temperature range, which may contribute to the low observed efficiency of Ga-rich CIGS solar cells.