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Sample records for force microscopy afm

  1. Atomically resolved force microscopy at room temperature

    SciTech Connect (OSTI)

    Morita, Seizo

    2014-04-24

    Atomic force microscopy (AFM) can now not only image individual atoms but also construct atom letters using atom manipulation method even at room temperature (RT). Therefore, the AFM is the second generation atomic tool following the scanning tunneling microscopy (STM). However the AFM can image even insulating atoms, and also directly measure/map the atomic force and potential at the atomic scale. Noting these advantages, we have been developing a bottom-up nanostructuring system at RT based on the AFM. It can identify chemical species of individual atoms and then manipulate selected atom species to the predesigned site one-by-one to assemble complex nanostructures consisted of multi atom species at RT. Here we introduce our results toward atom-by-atom assembly of composite nanostructures based on the AFM at RT including the latest result on atom gating of nano-space for atom-by-atom creation of atom clusters at RT for semiconductor surfaces.

  2. NREL: Measurements and Characterization - Atomic Force Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Force Microscopy Atomic Force Microscopy (AFM) operates in several modes. In contact mode, a tip that is attached to a cantilever is scanned over the sample surface, while the force between tip and sample is measured. While the tip is scanned laterally, the force is kept constant by moving the cantilever/tip assembly up and down, so that the deflection of the cantilever is kept constant. The vertical movement of the cantilever/tip assembly is recorded and used to generate an image of the

  3. Direct measurement of optical force induced by near-field plasmonic cavity using dynamic mode AFM

    SciTech Connect (OSTI)

    Guan, Dongshi; Hang, Zhi Hong; Marset, Zsolt; Liu, Hui; Kravchenko, Ivan I.; Chan, Ho Bun; Chan, C. T.; Tong, Penger

    2015-11-20

    Plasmonic nanostructures have attracted much attention in recent years because of their potential applications in optical manipulation through near-field enhancement. Continuing experimental efforts have been made to develop accurate techniques to directly measure the near-field optical force induced by the plasmonic nanostructures in the visible frequency range. In this work, we report a new application of dynamic mode atomic force microscopy (DM-AFM) in the measurement of the enhanced optical force acting on a nano-structured plasmonic resonant cavity. The plasmonic cavity is made of an upper gold-coated glass sphere and a lower quartz substrate patterned with an array of subwavelength gold disks. In the near-field when the sphere is positioned close to the disk array, plasmonic resonance is excited in the cavity and the induced force by a 1550 nm infrared laser is found to be increased by an order of magnitude compared with the photon pressure generated by the same laser light. Lastly, the experiment demonstrates that DM-AFM is a powerful tool for the study of light induced forces and their enhancement in plasmonic nanostructures.

  4. Direct measurement of optical force induced by near-field plasmonic cavity using dynamic mode AFM

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Guan, Dongshi; Hang, Zhi Hong; Marset, Zsolt; Liu, Hui; Kravchenko, Ivan I.; Chan, Ho Bun; Chan, C. T.; Tong, Penger

    2015-11-20

    Plasmonic nanostructures have attracted much attention in recent years because of their potential applications in optical manipulation through near-field enhancement. Continuing experimental efforts have been made to develop accurate techniques to directly measure the near-field optical force induced by the plasmonic nanostructures in the visible frequency range. In this work, we report a new application of dynamic mode atomic force microscopy (DM-AFM) in the measurement of the enhanced optical force acting on a nano-structured plasmonic resonant cavity. The plasmonic cavity is made of an upper gold-coated glass sphere and a lower quartz substrate patterned with an array of subwavelength goldmore » disks. In the near-field when the sphere is positioned close to the disk array, plasmonic resonance is excited in the cavity and the induced force by a 1550 nm infrared laser is found to be increased by an order of magnitude compared with the photon pressure generated by the same laser light. Lastly, the experiment demonstrates that DM-AFM is a powerful tool for the study of light induced forces and their enhancement in plasmonic nanostructures.« less

  5. Photothermally excited force modulation microscopy for broadband nanomechanical property measurements

    SciTech Connect (OSTI)

    Wagner, Ryan Killgore, Jason P.

    2015-11-16

    We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive frequency, thus avoiding the problem of spurious resonant vibrations that hinder piezoelectric excitation schemes. A complication of PTE FMM is that the sub-resonance cantilever vibration shape is fundamentally different compared to piezoelectric excitation. By directly measuring the vibrational shape of the cantilever, we show that PTE FMM is an accurate nanomechanical characterization method. PTE FMM is a pathway towards the characterization of frequency sensitive specimens such as polymers and biomaterials with frequency range limited only by the resonance frequency of the cantilever and the low frequency limit of the AFM.

  6. Contribution to crystallographic slip assessment by means of topographic measurements achieved with atomic force microscopy

    SciTech Connect (OSTI)

    Kahloun, C.; Badji, R.; Bacroix, B.; Bouabdallah, M.

    2010-09-15

    In this paper, atomic force microscopy (AFM) is used to quantitatively characterize the plastic glide occurring during tensile deformation of a duplex 2205 stainless steel sample. We demonstrate that an appropriate treatment of the topographic image issued from AFM measurements allows precise and quantitative information about the characteristics of plastic deformation and especially the amount of crystallographic slip.

  7. Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

    SciTech Connect (OSTI)

    Collins, Liam; Jesse, Stephen; Kilpatrick, J.; Tselev, Alexander; Okatan, Mahmut Baris; Kalinin, Sergei V.; Rodriguez, Brian

    2015-01-01

    Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q water and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid–liquid interface.

  8. Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam; Jesse, Stephen; Kilpatrick, J.; Tselev, Alexander; Okatan, Mahmut Baris; Kalinin, Sergei V.; Rodriguez, Brian

    2015-01-01

    Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q watermore » and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid–liquid interface.« less

  9. Piezoresponse Force Microscopy: A Window into Electromechanical...

    Office of Scientific and Technical Information (OSTI)

    Behavior at the Nanoscale Citation Details In-Document Search Title: Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Authors: Bonnell, ...

  10. Actuation of atomic force microscopy microcantilevers using contact acoustic nonlinearities

    SciTech Connect (OSTI)

    Torello, D.; Degertekin, F. Levent

    2013-11-15

    A new method of actuating atomic force microscopy (AFM) cantilevers is proposed in which a high frequency (>5 MHz) wave modulated by a lower frequency (∼300 kHz) wave passes through a contact acoustic nonlinearity at the contact interface between the actuator and the cantilever chip. The nonlinearity converts the high frequency, modulated signal to a low frequency drive signal suitable for actuation of tapping-mode AFM probes. The higher harmonic content of this signal is filtered out mechanically by the cantilever transfer function, providing for clean output. A custom probe holder was designed and constructed using rapid prototyping technologies and off-the-shelf components and was interfaced with an Asylum Research MFP-3D AFM, which was then used to evaluate the performance characteristics with respect to standard hardware and linear actuation techniques. Using a carrier frequency of 14.19 MHz, it was observed that the cantilever output was cleaner with this actuation technique and added no significant noise to the system. This setup, without any optimization, was determined to have an actuation bandwidth on the order of 10 MHz, suitable for high speed imaging applications. Using this method, an image was taken that demonstrates the viability of the technique and is compared favorably to images taken with a standard AFM setup.

  11. Spatial dependence of polycrystalline FTOs conductance analyzed by conductive atomic force microscope (C-AFM)

    SciTech Connect (OSTI)

    Peixoto, Alexandre Pessoa; Costa, J. C. da

    2014-05-15

    Fluorine-doped Tin oxide (FTO) is a highly transparent, electrically conductive polycrystalline material frequently used as an electrode in organic solar cells and optical-electronic devices [12]. In this work a spatial analysis of the conductive behavior of FTO was carried out by Conductive-mode Atomic Force Microscopy (C-AFM). Rare highly oriented grains sample give us an opportunity to analyze the top portion of polycrystalline FTO and compare with the border one. It is shown that the current flow essentially takes place through the polycrystalline edge at grain boundaries.

  12. Nanosecond switching in GeSe phase change memory films by atomic force microscopy

    SciTech Connect (OSTI)

    Bosse, James L.; Huey, Bryan D.; Grishin, Ilya; Kolosov, Oleg V.; Gyu Choi, Yong; Cheong, Byung-ki; Lee, Suyoun

    2014-02-03

    Nanosecond scale threshold switching is investigated with conducting atomic force microscopy (AFM) for an amorphous GeSe film. Switched bits exhibit 2–3 orders of magnitude variations in conductivity, as demonstrated in phase change based memory devices. Through the nm-scale AFM probe, this crystallization was achieved with pulse durations of as low as 15 ns, the fastest reported with scanning probe based methods. Conductance AFM imaging of the switched bits further reveals correlations between the switched volume, pulse amplitude, and pulse duration. The influence of film heterogeneities on switching is also directly detected, which is of tremendous importance for optimal device performance.

  13. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications

    SciTech Connect (OSTI)

    Morawski, Ireneusz; Spiegelberg, Richard; Korte, Stefan; Voigtländer, Bert

    2015-12-15

    A method which allows scanning tunneling microscopy (STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy (AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.

  14. Mapping power-law rheology of living cells using multi-frequency force modulation atomic force microscopy

    SciTech Connect (OSTI)

    Takahashi, Ryosuke; Okajima, Takaharu

    2015-10-26

    We present multi-frequency force modulation atomic force microscopy (AFM) for mapping the complex shear modulus G* of living cells as a function of frequency over the range of 50–500 Hz in the same measurement time as the single-frequency force modulation measurement. The AFM technique enables us to reconstruct image maps of rheological parameters, which exhibit a frequency-dependent power-law behavior with respect to G{sup *}. These quantitative rheological measurements reveal a large spatial variation in G* in this frequency range for single cells. Moreover, we find that the reconstructed images of the power-law rheological parameters are much different from those obtained in force-curve or single-frequency force modulation measurements. This indicates that the former provide information about intracellular mechanical structures of the cells that are usually not resolved with the conventional force measurement methods.

  15. Fidelity imaging for atomic force microscopy

    SciTech Connect (OSTI)

    Ghosal, Sayan Salapaka, Murti

    2015-01-05

    Atomic force microscopy is widely employed for imaging material at the nanoscale. However, real-time measures on image reliability are lacking in contemporary atomic force microscopy literature. In this article, we present a real-time technique that provides an image of fidelity for a high bandwidth dynamic mode imaging scheme. The fidelity images define channels that allow the user to have additional authority over the choice of decision threshold that facilitates where the emphasis is desired, on discovering most true features on the sample with the possible detection of high number of false features, or emphasizing minimizing instances of false detections. Simulation and experimental results demonstrate the effectiveness of fidelity imaging.

  16. Liquid contact resonance atomic force microscopy via experimental reconstruction of the hydrodynamic function

    SciTech Connect (OSTI)

    Tung, Ryan C. Killgore, Jason P.; Hurley, Donna C.

    2014-06-14

    We present a method to correct for surface-coupled inertial and viscous fluid loading forces in contact resonance (CR) atomic force microscopy (AFM) experiments performed in liquid. Based on analytical hydrodynamic theory, the method relies on experimental measurements of the AFM cantilever's free resonance peaks near the sample surface. The free resonance frequencies and quality factors in both air and liquid allow reconstruction of a continuous hydrodynamic function that can be used to adjust the CR data in liquid. Validation experiments utilizing thermally excited free and in-contact spectra were performed to assess the accuracy of our approach. Results show that the method recovers the air frequency values within approximately 6%. Knowledge of fluid loading forces allows current CR analysis techniques formulated for use in air and vacuum environments to be applied to liquid environments. Our technique greatly extends the range of measurement environments available to CR-AFM.

  17. Imaging and quantitative data acquisition of biological cell walls with Atomic Force Microscopy and Scanning Acoustic Microscopy

    SciTech Connect (OSTI)

    Tittmann, B. R.; Xi, X.

    2014-09-01

    This chapter demonstrates the feasibility of Atomic Force Microscopy (AFM) and High Frequency Scanning Acoustic Microscopy (HF-SAM) as tools to characterize biological tissues. Both the AFM and the SAM have shown to provide imaging (with different resolution) and quantitative elasticity measuring abilities. Plant cell walls with minimal disturbance and under conditions of their native state have been examined with these two kinds of microscopy. After descriptions of both the SAM and AFM, their special features and the typical sample preparation is discussed. The sample preparation is focused here on epidermal peels of onion scales and celery epidermis cells which were sectioned for the AFM to visualize the inner surface (closest to the plasma membrane) of the outer epidermal wall. The nm-wide cellulose microfibrils orientation and multilayer structure were clearly observed. The microfibril orientation and alignment tend to be more organized in older scales compared with younger scales. The onion epidermis cell wall was also used as a test analog to study cell wall elasticity by the AFM nanoindentation and the SAM V(z) feature. The novelty in this work was to demonstrate the capability of these two techniques to analyze isolated, single layered plant cell walls in their natural state. AFM nanoindentation was also used to probe the effects of Ethylenediaminetetraacetic acid (EDTA), and calcium ion treatment to modify pectin networks in cell walls. The results suggest a significant modulus increase in the calcium ion treatment and a slight decrease in EDTA treatment. To complement the AFM measurements, the HF-SAM was used to obtain the V(z) signatures of the onion epidermis. These measurements were focused on documenting the effect of pectinase enzyme treatment. The results indicate a significant change in the V(z) signature curves with time into the enzyme treatment. Thus AFM and HF-SAM open the door to a systematic nondestructive structure and mechanical property

  18. Physical mechanisms of megahertz vibrations and nonlinear detection in ultrasonic force and related microscopies

    SciTech Connect (OSTI)

    Bosse, J. L.; Huey, B. D.; Tovee, P. D.; Kolosov, O. V.

    2014-04-14

    Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced nanoscale property mapping to video rates, allowed use of cantilever dynamics for mapping nanomechanical properties of stiff materials, sensing ?s time scale phenomena in nanostructures, and enabled detection of subsurface features with nanoscale resolution. All of these methods critically depend on the generally poor characterized HF behaviour of AFM cantilevers in contact with a studied sample, spatial and frequency response of piezotransducers, and transfer of ultrasonic vibrations between the probe and a specimen. Focusing particularly on Ultrasonic Force Microscopy (UFM), this work is also applicable to waveguide UFM, heterodyne force microscopy, and near-field holographic microscopy, all methods that exploit nonlinear tip-surface force interactions at high frequencies. Leveraging automated multidimensional measurements, spectroscopic UFM (sUFM) is introduced to investigate a range of common experimental parameters, including piezotransducer excitation frequency, probed position, ultrasonic amplitude, cantilever geometry, spring constant, and normal force. Consistent with studies of influence of each of these factors, the data-rich sUFM signatures allow efficient optimization of ultrasonic-AFM based measurements, leading to best practices recommendations of using longer cantilevers with lower fundamental resonance, while at the same time increasing the central frequency of HF piezo-actuators, and only comparing results within areas on the order of few ?m{sup 2} unless calibrated directly or compared with in-the-imaged area standards. Diverse materials such as Si, Cr, and photoresist are specifically investigated. This work thereby provides essential insight into the reliable use of MHz vibrations with AFM and provides direct evidence substantiating phenomena such as sensitivity to adhesion, diminished friction for certain ultrasonic conditions, and the particular

  19. Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

    SciTech Connect (OSTI)

    Ramos, Jorge R.

    2014-07-28

    The acquisition of high resolution images in atomic force microscopy (AFM) is correlated to the cantilever's tip shape, size, and imaging conditions. In this work, relative tip wear is quantified based on the evolution of a direct experimental observable in amplitude modulation atomic force microscopy, i.e., the critical amplitude. We further show that the scanning parameters required to guarantee a maximum compressive stress that is lower than the yield/fracture stress of the tip can be estimated via experimental observables. In both counts, the optimized parameters to acquire AFM images while preserving the tip are discussed. The results are validated experimentally by employing IgG antibodies as a model system.

  20. Investigation of leakage current paths in n-GaN by conductive atomic force microscopy

    SciTech Connect (OSTI)

    Kim, Bumho; Park, Yongjo E-mail: eyoon@snu.ac.kr; Moon, Daeyoung; Nanishi, Yasushi; Joo, Kisu; Department of Nano Science and Technology, Graduate School of Convergence Science and Technology, Seoul National University, Suwon 443-270 ; Oh, Sewoung; Lee, Young Kuk; Yoon, Euijoon E-mail: eyoon@snu.ac.kr; WCU Hybrid Materials Program, Department of Materials Science and Engineering, Seoul National University, Seoul 151-742; Department of Nano Science and Technology, Graduate School of Convergence Science and Technology, Seoul National University, Suwon 443-270; Department of Materials Science and Engineering, Seoul National University, Seoul 151-742

    2014-03-10

    We have investigated electrical characteristics of leakage current paths in n-GaN layer grown by metal-organic chemical vapor deposition with conductive-atomic force microscopy (C-AFM). The C-AFM mapping shows two kinds of leakage current paths existing in the n-GaN layer: open-core dislocation and pure screw dislocation. From the localized I-V curves measured by C-AFM, we confirmed that the open-core screw dislocation shows more significant leakage current. We explained these results in terms of a modified Schottky band model based on donor states formed by oxygen segregation at the (10−10) sidewall of the open-core screw dislocation.

  1. A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Solares, Santiago D.

    2015-11-26

    This study introduces a quasi-3-dimensional (Q3D) viscoelastic model and software tool for use in atomic force microscopy (AFM) simulations. The model is based on a 2-dimensional array of standard linear solid (SLS) model elements. The well-known 1-dimensional SLS model is a textbook example in viscoelastic theory but is relatively new in AFM simulation. It is the simplest model that offers a qualitatively correct description of the most fundamental viscoelastic behaviors, namely stress relaxation and creep. However, this simple model does not reflect the correct curvature in the repulsive portion of the force curve, so its application in the quantitative interpretationmore » of AFM experiments is relatively limited. In the proposed Q3D model the use of an array of SLS elements leads to force curves that have the typical upward curvature in the repulsive region, while still offering a very low computational cost. Furthermore, the use of a multidimensional model allows for the study of AFM tips having non-ideal geometries, which can be extremely useful in practice. Examples of typical force curves are provided for single- and multifrequency tappingmode imaging, for both of which the force curves exhibit the expected features. Lastly, a software tool to simulate amplitude and phase spectroscopy curves is provided, which can be easily modified to implement other controls schemes in order to aid in the interpretation of AFM experiments.« less

  2. A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Solares, Santiago D.

    2015-11-26

    This study introduces a quasi-3-dimensional (Q3D) viscoelastic model and software tool for use in atomic force microscopy (AFM) simulations. The model is based on a 2-dimensional array of standard linear solid (SLS) model elements. The well-known 1-dimensional SLS model is a textbook example in viscoelastic theory but is relatively new in AFM simulation. It is the simplest model that offers a qualitatively correct description of the most fundamental viscoelastic behaviors, namely stress relaxation and creep. However, this simple model does not reflect the correct curvature in the repulsive portion of the force curve, so its application in the quantitative interpretation of AFM experiments is relatively limited. In the proposed Q3D model the use of an array of SLS elements leads to force curves that have the typical upward curvature in the repulsive region, while still offering a very low computational cost. Furthermore, the use of a multidimensional model allows for the study of AFM tips having non-ideal geometries, which can be extremely useful in practice. Examples of typical force curves are provided for single- and multifrequency tappingmode imaging, for both of which the force curves exhibit the expected features. Lastly, a software tool to simulate amplitude and phase spectroscopy curves is provided, which can be easily modified to implement other controls schemes in order to aid in the interpretation of AFM experiments.

  3. Full information acquisition in piezoresponse force microscopy

    SciTech Connect (OSTI)

    Somnath, Suhas; Belianinov, Alex; Jesse, Stephen; Kalinin, Sergei V.

    2015-12-28

    The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.

  4. Full information acquisition in piezoresponse force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Somnath, Suhas; Belianinov, Alex; Jesse, Stephen; Kalinin, Sergei V.

    2015-12-28

    The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separatemore » the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.« less

  5. Ultrasonic-Based Mode-Synthesizing Atomic Force Microscopy -...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Only ultrasonic-based atomic force microscopy in the industry Sufficiently flexible for compatibility with spectroscopic approaches such as Raman spectroscopy Easily adaptable to ...

  6. Half-harmonic Kelvin probe force microscopy with transfer function...

    Office of Scientific and Technical Information (OSTI)

    Using linear and half-harmonic BE enables quantitative correction of the cantilever transfer function. Half-harmonic band excitation Kelvin probe force microscopy (HBE KPFM) thus ...

  7. Autopilot for frequency-modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kuchuk, Kfir; Schlesinger, Itai; Sivan, Uri

    2015-10-15

    One of the most challenging aspects of operating an atomic force microscope (AFM) is finding optimal feedback parameters. This statement applies particularly to frequency-modulation AFM (FM-AFM), which utilizes three feedback loops to control the cantilever excitation amplitude, cantilever excitation frequency, and z-piezo extension. These loops are regulated by a set of feedback parameters, tuned by the user to optimize stability, sensitivity, and noise in the imaging process. Optimization of these parameters is difficult due to the coupling between the frequency and z-piezo feedback loops by the non-linear tip-sample interaction. Four proportional-integral (PI) parameters and two lock-in parameters regulating these loops require simultaneous optimization in the presence of a varying unknown tip-sample coupling. Presently, this optimization is done manually in a tedious process of trial and error. Here, we report on the development and implementation of an algorithm that computes the control parameters automatically. The algorithm reads the unperturbed cantilever resonance frequency, its quality factor, and the z-piezo driving signal power spectral density. It analyzes the poles and zeros of the total closed loop transfer function, extracts the unknown tip-sample transfer function, and finds four PI parameters and two lock-in parameters for the frequency and z-piezo control loops that optimize the bandwidth and step response of the total system. Implementation of the algorithm in a home-built AFM shows that the calculated parameters are consistently excellent and rarely require further tweaking by the user. The new algorithm saves the precious time of experienced users, facilitates utilization of FM-AFM by casual users, and removes the main hurdle on the way to fully automated FM-AFM.

  8. Design and optimization of a harmonic probe with step cross section in multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Cai, Jiandong; Zhang, Li; Wang, Michael Yu

    2015-12-15

    In multifrequency atomic force microscopy (AFM), probe’s characteristic of assigning resonance frequencies to integer harmonics results in a remarkable improvement of detection sensitivity at specific harmonic components. The selection criterion of harmonic order is based on its amplitude’s sensitivity on material properties, e.g., elasticity. Previous studies on designing harmonic probe are unable to provide a large design capability along with maintaining the structural integrity. Herein, we propose a harmonic probe with step cross section, in which it has variable width in top and bottom steps, while the middle step in cross section is kept constant. Higher order resonance frequencies are tailored to be integer times of fundamental resonance frequency. The probe design is implemented within a structural optimization framework. The optimally designed probe is micromachined using focused ion beam milling technique, and then measured with an AFM. The measurement results agree well with our resonance frequency assignment requirement.

  9. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  10. Phase contrast and operation regimes in multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Santos, Sergio

    2014-04-07

    In amplitude modulation atomic force microscopy the attractive and the repulsive force regimes induce phase shifts above and below 90°, respectively. In the more recent multifrequency approach, however, multiple operation regimes have been reported and the theory should be revisited. Here, a theory of phase contrast in multifrequency atomic force microscopy is developed and discussed in terms of energy transfer between modes, energy dissipation and the kinetic energy and energy transfer associated with externally driven harmonics. The single frequency virial that controls the phase shift might undergo transitions in sign while the average force (modal virial) remains positive (negative)

  11. Cross-sectional electrostatic force microscopy of thin-film solar cells

    SciTech Connect (OSTI)

    Ballif, C.; Moutinho, H. R.; Al-Jassim, M. M.

    2001-01-15

    In a recent work, we showed that atomic force microscopy (AFM) is a powerful technique to image cross sections of polycrystalline thin films. In this work, we apply a modification of AFM, namely, electrostatic force microscopy (EFM), to investigate the electronic properties of cleaved II--VI and multijunction thin-film solar cells. We cleave the devices in such a way that they are still working with their nominal photovoltaic efficiencies and can be polarized for the measurements. This allows us to differentiate between surface effects (work function and surface band bending) and bulk device properties. In the case of polycrystalline CdTe/CdS/SnO{sub 2}/glass solar cells, we find a drop of the EFM signal in the area of the CdTe/CdS interface ({+-}50 nm). This drop varies in amplitude and sign according to the applied external bias and is compatible with an n-CdS/p-CdTe heterojunction model, thereby invalidating the possibility of a deeply buried n-p CdTe homojunction. In the case of a triple-junction GaInP/GaAs/Ge device, we observe a variation of the EFM signal linked to both the material work-function differences and to the voltage bias applied to the cell. We attempt a qualitative explanation of the results and discuss the implications and difficulties of the EFM technique for the study of such thin-film devices.

  12. Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

    SciTech Connect (OSTI)

    Miccio, Luis A. Colmenero, Juan; Kummali, Mohammed M.; Alegra, ngel; Schwartz, Gustavo A.

    2014-05-14

    The use of an atomic force microscope for studying molecular dynamics through dielectric spectroscopy with spatial resolution in the nanometer scale is a recently developed approach. However, difficulties in the quantitative connection of the obtained data and the material dielectric properties, namely, frequency dependent dielectric permittivity, have limited its application. In this work, we develop a simple electrical model based on physically meaningful parameters to connect the atomic force microscopy (AFM) based dielectric spectroscopy experimental results with the material dielectric properties. We have tested the accuracy of the model and analyzed the relevance of the forces arising from the electrical interaction with the AFM probe cantilever. In this way, by using this model, it is now possible to obtain quantitative information of the local dielectric material properties in a broad frequency range. Furthermore, it is also possible to determine the experimental setup providing the best sensitivity in the detected signal.

  13. In Situ Transmission Electron Microscopy

    Office of Scientific and Technical Information (OSTI)

    ... Nanofactory Atomic Force Microscopy (AFM) Stage * Measures force interactions on samples with higher sensitivity than the NanoIndentation stage * Load range between 10 - 2,000 nN * ...

  14. Imaging and measuring the biophysical properties of Fc gamma receptors on single macrophages using atomic force microscopy

    SciTech Connect (OSTI)

    Li, Mi; University of Chinese Academy of Sciences, Beijing 100049 ; Liu, Lianqing; Xi, Ning; Wang, Yuechao; Xiao, Xiubin; Zhang, Weijing

    2013-09-06

    Highlights: Nanoscale cellular ultra-structures of macrophages were observed. The binding affinities of Fc?Rs were measured directly on macrophages. The nanoscale distributions of Fc?Rs were mapped on macrophages. -- Abstract: Fc gamma receptors (Fc?R), widely expressed on effector cells (e.g., NK cells, macrophages), play an important role in clinical cancer immunotherapy. The binding of Fc?Rs to the Fc portions of antibodies that are attached to the target cells can activate the antibody-dependent cell-mediated cytotoxicity (ADCC) killing mechanism which leads to the lysis of target cells. In this work, we used atomic force microscopy (AFM) to observe the cellular ultra-structures and measure the biophysical properties (affinity and distribution) of Fc?Rs on single macrophages in aqueous environments. AFM imaging was used to obtain the topographies of macrophages, revealing the nanoscale cellular fine structures. For molecular interaction recognition, antibody molecules were attached onto AFM tips via a heterobifunctional polyethylene glycol (PEG) crosslinker. With AFM single-molecule force spectroscopy, the binding affinities of Fc?Rs were quantitatively measured on single macrophages. Adhesion force mapping method was used to localize the Fc?Rs, revealing the nanoscale distribution of Fc?Rs on local areas of macrophages. The experimental results can improve our understanding of Fc?Rs on macrophages; the established approach will facilitate further research on physiological activities involved in antibody-based immunotherapy.

  15. A variable-width harmonic probe for multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Cai, Jiandong; Zhang, Li; Xia, Qi E-mail: michael.wang@nus.edu.sg; Luo, Yangjun; Wang, Michael Yu E-mail: michael.wang@nus.edu.sg

    2015-02-16

    In multifrequency atomic force microscopy (AFM) to simultaneously measure topography and material properties of specimens, it is highly desirable that the higher order resonance frequencies of the cantilever probe are assigned to be integer harmonics of the excitation frequency. The harmonic resonances are essential for significant enhancement of the probe's response at the specified harmonic frequencies. In this letter, a structural optimization technique is employed to design cantilever probes so that the ratios between one or more higher order resonance frequencies and the fundamental natural frequency are ensured to be equal to specified integers and, in the meantime, that the fundamental natural frequency is maximized. Width profile of the cantilever probe is the design variable in optimization. Thereafter, the probes were prepared by modifying a commercial probe through the focused ion beam (FIB) milling. The resonance frequencies of the FIB fabricated probes were measured with an AFM. Results of the measurement show that the optimal design of probe is as effective as design prediction.

  16. Note: A silicon-on-insulator microelectromechanical systems probe scanner for on-chip atomic force microscopy

    SciTech Connect (OSTI)

    Fowler, Anthony G.; Maroufi, Mohammad; Moheimani, S. O. Reza

    2015-04-15

    A new microelectromechanical systems-based 2-degree-of-freedom (DoF) scanner with an integrated cantilever for on-chip atomic force microscopy (AFM) is presented. The silicon cantilever features a layer of piezoelectric material to facilitate its use for tapping mode AFM and enable simultaneous deflection sensing. Electrostatic actuators and electrothermal sensors are used to accurately position the cantilever within the x-y plane. Experimental testing shows that the cantilever is able to be scanned over a 10 μm × 10 μm window and that the cantilever achieves a peak-to-peak deflection greater than 400 nm when excited at its resonance frequency of approximately 62 kHz.

  17. Intermodulation electrostatic force microscopy for imaging surface photo-voltage

    SciTech Connect (OSTI)

    Borgani, Riccardo Forchheimer, Daniel; Thorn, Per-Anders; Haviland, David B.; Bergqvist, Jonas; Ingans, Olle

    2014-10-06

    We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear capacitance gives intermodulation products of the two drive frequencies near the cantilever resonance, where they are measured with high signal to noise ratio. Analysis of this intermodulation response allows for quantitative reconstruction of the contact potential difference. We derive the theory of the method, validate it with numerical simulation and a control experiment, and we demonstrate its utility for fast imaging of the surface photo-voltage on an organic photo-voltaic material.

  18. Mapping of Proteomic Composition on the Surfaces of Bacillus spores by Atomic Force Microscopy-based Immunolabeling

    SciTech Connect (OSTI)

    Plomp, M; Malkin, A J

    2008-06-02

    Atomic force microscopy provides a unique capability to image high-resolution architecture and structural dynamics of pathogens (e.g. viruses, bacteria and bacterial spores) at near molecular resolution in native conditions. Further development of atomic force microscopy in order to enable the correlation of pathogen protein surface structures with specific gene products is essential to understand the mechanisms of the pathogen life cycle. We have applied an AFM-based immunolabeling technique for the proteomic mapping of macromolecular structures through the visualization of the binding of antibodies, conjugated with nanogold particles, to specific epitopes on Bacillus spore surfaces. This information is generated while simultaneously acquiring the surface morphology of the pathogen. The immunospecificity of this labeling method was established through the utilization of specific polyclonal and monoclonal antibodies that target spore coat and exosporium epitopes of Bacillus atrophaeus and Bacillus anthracis spores.

  19. Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kobayashi, Kei; Yamada, Hirofumi; Matsushige, Kazumi

    2011-03-15

    We recently reported the analysis of the frequency noise in the frequency modulation atomic force microscopy (FM-AFM) both in high-Q and low-Q environments [Rev. Sci. Instrum. 80, 043708 (2009)]. We showed in the paper that the oscillator noise, the frequency fluctuation of the oscillator, becomes prominent in the modulation frequency lower than f{sub 0}/2Q, where f{sub 0} and Q are the resonance frequency and Q-factor. The magnitude of the oscillator noise is determined by the slope of the phase versus frequency curve of the cantilever at f{sub 0}. However, in actual FM-AFM in liquids, the phase versus frequency curve may not be always ideal because of the existence of various phase shifting elements (PSEs). For example, the spurious resonance peaks caused by the acoustic excitation and a band-pass filter in the self-oscillation loop increase the slope of the phase versus frequency curve. Due to those PSEs, the effective Q-factor is often increased from the intrinsic Q-factor of the cantilever. In this article, the frequency noise in the FM-AFM system with the PSEs in the self-oscillation loop is analyzed to show that the oscillator noise is reduced by the increase of the effective Q-factor. It is also shown that the oscillation frequency deviates from the resonance frequency due to the increase of the effective Q-factor, thereby causing the reduction in the frequency shift signal with the same factor. Therefore the increase of the effective Q-factor does not affect the signal-to-noise ratio in the frequency shift measurement, but it does affect the quantitativeness of the measured force in the FM-AFM. Furthermore, the reduction of the frequency noise and frequency shift by the increase of the effective Q-factor were confirmed by the experiments.

  20. Charge transfer of single laser crystallized intrinsic and phosphorus-doped Si-nanocrystals visualized by Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Xu, Jie; Xu, Jun Lu, Peng; Shan, Dan; Li, Wei; Chen, Kunji

    2014-10-07

    Isolated intrinsic and phosphorus doped (P-doped) Si-nanocrystals (Si-NCs) on n- and p-Si substrates are fabricated by excimer laser crystallization techniques. The formation of Si-NCs is confirmed by atomic force microscopy (AFM) and conductive AFM measurements. Kelvin probe force microscopy (KPFM) is then carried out to visualize the trapped charges in a single Si-NC dot which derives from the charge transfer between Si-NCs and Si substrates due to their different Fermi levels. The laser crystallized P-doped Si-NCs have a similar Fermi level around the mid-gap to the intrinsic counterparts, which might be caused by the inactivated impurity atoms or the surface states-related Fermi level pinning. A clear rise of the Fermi level in P-doped Si-NCs is observed after a short time thermal annealing treatment, indicating the activation of dopants in Si-NCs. Moreover, the surface charge quantity can be estimated using a simple parallel plate capacitor model for a quantitative understanding of the KPFM results at the nanoscale.

  1. Exploring Local Electrostatic Effects with Scanning Probe Microscopy: Implications for Piezoresponse Force Microscopy and Triboelectricity

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Balke, Nina; Maksymovych, Petro; Jesse, Stephen; Kravchenko, Ivan I.; Li, Qian; Kalinin, Sergei V.

    2014-09-25

    The implementation of contact mode Kelvin probe force microscopy (KPFM) utilizes the electrostatic interactions between tip and sample when the tip and sample are in contact with each other. Surprisingly, the electrostatic forces in contact are large enough to be measured even with tips as stiff as 4.5 N/m. As for traditional non-contact KPFM, the signal depends strongly on electrical properties of the sample, such as the dielectric constant, and the tip-properties, such as the stiffness. Since the tip is in contact with the sample, bias-induced changes in the junction potential between tip and sample can be measured with highermore » lateral and temporal resolution compared to traditional non-contact KPFM. Significant and reproducible variations of tip-surface capacitance are observed and attributed to surface electrochemical phenomena. Lastly, observations of significant surface charge states at zero bias and strong hysteretic electromechanical responses at non-ferroelectric surface have significant implications for fields such as triboelectricity and piezoresponse force microscopy.« less

  2. G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam; Belianinov, Alex; Proksch, Roger; Zuo, Tingting; Zhang, Yong; Liaw, Peter K.; Kalinin, Sergei V.; Jesse, Stephen

    2016-05-09

    We develop a full information capture approach for Magnetic Force Microscopy (MFM), referred to as generalized mode (G-Mode) MFM. G-Mode MFM acquires and stores the full data stream from the photodetector at sampling rates approaching the intrinsic photodiode limit. The data can be subsequently compressed, denoised, and analyzed, without information loss. Also, 3 G-Mode MFM is implemented and compared to traditional heterodyne based MFM on model systems including domain structures in ferromagnetic Yttrium Iron Garnet (YIG) and electronically and magnetically inhomogeneous high entropy alloy, CoFeMnNiSn. We investigate the use of information theory to mine the G-Mode MFM data and demonstratemore » its usefulness for extracting information which may be hidden in traditional MFM modes, including signatures of nonlinearities and mode coupling phenomena. Finally we demonstrate detection and separation of magnetic and electrostatic tip-sample interactions from a single G-Mode image, by analyzing the entire frequency response of the cantilever. G-Mode MFM is immediately implementable on any AFM platform and as such is expected to be a useful technique for probing spatiotemporal cantilever dynamics and mapping material properties as well as their mutual interactions.« less

  3. Structure and Dynamics of Dinucleosomes Assessed by Atomic Force Microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Filenko, Nina A.; Palets, Dmytro B.; Lyubchenko, Yuri L.

    2012-01-01

    Dynamics of nucleosomes and their interactions are important for understanding the mechanism of chromatin assembly. Internucleosomal interaction is required for the formation of higher-order chromatin structures. Although H1 histone is critically involved in the process of chromatin assembly, direct internucleosomal interactions contribute to this process as well. To characterize the interactions of nucleosomes within the nucleosome array, we designed a dinucleosome and performed direct AFM imaging. The analysis of the AFM data showed dinucleosomes are very dynamic systems, enabling the nucleosomes to move in a broad range along the DNA template. Di-nucleosomes in close proximity were observed, but their populationmore » was low. The use of the zwitterionic detergent, CHAPS, increased the dynamic range of the di-nucleosome, facilitating the formation of tight di-nucleosomes. The role of CHAPS and similar natural products in chromatin structure and dynamics is also discussed.« less

  4. Atomic force microscopy investigation of the giant mimivirus

    SciTech Connect (OSTI)

    Kuznetsov, Yuri G.; Xiao Chuan; Sun Siyang; Raoult, Didier; Rossmann, Michael; McPherson, Alexander

    2010-08-15

    Mimivirus was investigated by atomic force microscopy in its native state following serial degradation by lysozyme and bromelain. The 750-nm diameter virus is coated with a forest of glycosylated protein fibers of lengths about 140 nm with diameters 1.4 nm. Fibers are capped with distinctive ellipsoidal protein heads of estimated Mr = 25 kDa. The surface fibers are attached to the particle through a layer of protein covering the capsid, which is in turn composed of the major capsid protein (MCP). The latter is organized as an open network of hexagonal rings with central depressions separated by 14 nm. The virion exhibits an elaborate apparatus at a unique vertex, visible as a star shaped depression on native particles, but on defibered virions as five arms of 50 nm width and 250 nm length rising above the capsid by 20 nm. The apparatus is integrated into the capsid and not applied atop the icosahedral lattice. Prior to DNA release, the arms of the star disengage from the virion and it opens by folding back five adjacent triangular faces. A membrane sac containing the DNA emerges from the capsid in preparation for fusion with a membrane of the host cell. Also observed from disrupted virions were masses of distinctive fibers of diameter about 1 nm, and having a 7-nm periodicity. These are probably contained within the capsid along with the DNA bearing sac. The fibers were occasionally observed associated with toroidal protein clusters interpreted as processive enzymes modifying the fibers.

  5. Local elastic modulus of RF sputtered HfO{sub 2} thin film by atomic force acoustic microscopy

    SciTech Connect (OSTI)

    Jena, S. Tokas, R. B. Sarkar, P. Thakur, S.; Sahoo, N. K.; Misal, J. S.; Rao, K. D.

    2014-04-24

    Atomic force acoustic microscopy (AFAM) is a useful nondestructive technique for measurement of local elastic modulus of materials at nano-scale spatial resolution by measuring the contact resonance spectra for higher order modes of the AFM cantilever. The elastic modulus of RF sputtered HfO{sub 2} thin film has been measured quantitatively, using reference approach in which measurements are performed on the test and reference samples. Using AFAM, the measured elastic modulus of the HfO{sub 2} thin film is 223±27 GPa, which is in agreement with the literature value of 220±40 GPa for atomic layer deposited HfO{sub 2} thin film using nanoindentation technique.

  6. Selection of higher eigenmode amplitude based on dissipated power and virial contrast in bimodal atomic force microscopy

    SciTech Connect (OSTI)

    Diaz, Alfredo J.; Eslami, Babak; Lpez-Guerra, Enrique A.; Solares, Santiago D.

    2014-09-14

    This paper explores the effect of the amplitude ratio of the higher to the fundamental eigenmode in bimodal atomic force microscopy (AFM) on the phase contrast and the dissipated power contrast of the higher eigenmode. We explore the optimization of the amplitude ratio in order to maximize the type of contrast that is most relevant to the particular study. Specifically, we show that the trends in the contrast range behave differently for different quantities, especially the dissipated power and the phase, with the former being more meaningful than the latter (a similar analysis can be carried out using the virial, for which we also provide a brief example). Our work is based on numerical simulations using two different conservative-dissipative tip-sample models, including the standard linear solid and the combination of a dissipation coefficient with a conservative model, as well as experimental images of thin film Nafion{sup } proton exchange polymers. We focus on the original bimodal AFM method, where the higher eigenmode is driven with constant amplitude and frequency (i.e., in open loop).

  7. Workshop on Atomic Force Microscopy, Nanometrology and More ...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Swarna Addepalli 2012.12.17 One of my colleagues from our global research center in India, K.G. V. Siva Kumar (Sivakumar), recently attended a workshop on Atomic Force...

  8. Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Solares, Santiago D.

    2016-04-15

    Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip-sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surfacemore » as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young's modulus. Relevant cases are discussed for single-and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip-sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. As a result, a multifrequency AFM simulation tool based on the above sample model is provided as supporting information.« less

  9. Sensing Current and Forces with SPM

    SciTech Connect (OSTI)

    Park, Jeong Y.; Maier, Sabine; Hendriksen, Bas; Salmeron, Miquel

    2010-07-02

    Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces during STM and the detection of currents during AFM can give valuable additional information of the nanoscale material properties.

  10. Cross-Sectional Conductive Atomic Force Microscopy of CdTe/CdS Solar Cells: Effects of Etching and Back-Contact Processes; Preprint

    SciTech Connect (OSTI)

    Moutinho, H. R.; Dhere, R. G.; Jiang, C.-S.; Gessert, T. A.; Duda, A. M.; Young, M.; Metzger, W. K.; Li, X.; Al-Jassim, M. M.

    2006-05-01

    We investigated the effects of the etching processes using bromine and nitric-phosphoric acid solutions, as well as of Cu, in the bulk electrical conductivity of CdTe/CdS solar cells using conductive atomic force microscopy (C-AFM). Although the etching process can create a conductive layer on the surface of the CdTe, the layer is very shallow. In contrast, the addition of a thin layer of Cu to the surface creates a conductive layer inside the CdTe that is not uniform in depth, is concentrated at grains boundaries, and may short circuit the device if the CdTe is too thin. The etching process facilitates the Cu diffusion and results in thicker conductive layers. The existence of this inhomogeneous conductive layer directly affects the current transport and is probably the reason for needing thick CdTe in these devices.

  11. High-speed adaptive contact-mode atomic force microscopy imaging with near-minimum-force

    SciTech Connect (OSTI)

    Ren, Juan; Zou, Qingze

    2014-07-15

    In this paper, an adaptive contact-mode imaging approach is proposed to replace the traditional contact-mode imaging by addressing the major concerns in both the speed and the force exerted to the sample. The speed of the traditional contact-mode imaging is largely limited by the need to maintain precision tracking of the sample topography over the entire imaged sample surface, while large image distortion and excessive probe-sample interaction force occur during high-speed imaging. In this work, first, the image distortion caused by the topography tracking error is accounted for in the topography quantification. Second, the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next-line topography is integrated to the topography feeedback loop to enhance the sample topography tracking. The proposed approach is demonstrated and evaluated through imaging a calibration sample of square pitches at both high speeds (e.g., scan rate of 75 Hz and 130 Hz) and large sizes (e.g., scan size of 30 ?m and 80??m). The experimental results show that compared to the traditional constant-force contact-mode imaging, the imaging speed can be increased by over 30 folds (with the scanning speed at 13 mm/s), and the probe-sample interaction force can be reduced by more than 15% while maintaining the same image quality.

  12. Parameter sensitivity analysis of nonlinear piezoelectric probe in tapping mode atomic force microscopy for measurement improvement

    SciTech Connect (OSTI)

    McCarty, Rachael; Nima Mahmoodi, S.

    2014-02-21

    The equations of motion for a piezoelectric microcantilever are derived for a nonlinear contact force. The analytical expressions for natural frequencies and mode shapes are obtained. Then, the method of multiple scales is used to analyze the analytical frequency response of the piezoelectric probe. The effects of nonlinear excitation force on the microcantilever beam's frequency and amplitude are analytically studied. The results show a frequency shift in the response resulting from the force nonlinearities. This frequency shift during contact mode is an important consideration in the modeling of AFM mechanics for generation of more accurate imaging. Also, a sensitivity analysis of the system parameters on the nonlinearity effect is performed. The results of a sensitivity analysis show that it is possible to choose parameters such that the frequency shift minimizes. Certain parameters such as tip radius, microcantilever beam dimensions, and modulus of elasticity have more influence on the nonlinearity of the system than other parameters. By changing only three parameters—tip radius, thickness, and modulus of elasticity of the microbeam—a more than 70% reduction in nonlinearity effect was achieved.

  13. Effect of current compliance and voltage sweep rate on the resistive switching of HfO{sub 2}/ITO/Invar structure as measured by conductive atomic force microscopy

    SciTech Connect (OSTI)

    Wu, You-Lin Liao, Chun-Wei; Ling, Jing-Jenn

    2014-06-16

    The electrical characterization of HfO{sub 2}/ITO/Invar resistive switching memory structure was studied using conductive atomic force microscopy (AFM) with a semiconductor parameter analyzer, Agilent 4156C. The metal alloy Invar was used as the metal substrate to ensure good ohmic contact with the substrate holder of the AFM. A conductive Pt/Ir AFM tip was placed in direct contact with the HfO{sub 2} surface, such that it acted as the top electrode. Nanoscale current-voltage (I-V) characteristics of the HfO{sub 2}/ITO/Invar structure were measured by applying a ramp voltage through the conductive AFM tip at various current compliances and ramp voltage sweep rates. It was found that the resistance of the low resistance state (RLRS) decreased with increasing current compliance value, but resistance of high resistance state (RHRS) barely changed. However, both the RHRS and RLRS decreased as the voltage sweep rate increased. The reasons for this dependency on current compliance and voltage sweep rate are discussed.

  14. Probing ternary solvent effect in high Voc polymer solar cells using advanced AFM techniques

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Li, Chao; Soleman, Mikhael; Lorenzo, Josie; Dhasmana, Nitesh; Chantharasupawong, Panit; Ievlev, Anton; Gesquiere, Andre; Tetard, Laurene; Thomas, Jayan

    2016-01-25

    This work describes a simple method to develop a high Voc low band gap PSCs. In addition, two new atomic force microscopy (AFM)-based nanoscale characterization techniques to study the surface morphology and physical properties of the structured active layer are introduced. With the help of ternary solvent processing of the active layer and C60 buffer layer, a bulk heterojunction PSC with Voc more than 0.9 V and conversion efficiency 7.5% is developed. In order to understand the fundamental properties of the materials ruling the performance of the PSCs tested, AFM-based nanoscale characterization techniques including Pulsed-Force-Mode AFM (PFM-AFM) and Mode-Synthesizing AFMmore » (MSAFM) are introduced. Interestingly, MSAFM exhibits high sensitivity for direct visualization of the donor–acceptor phases in the active layer of the PSCs. Lastly, conductive-AFM (cAFM) studies reveal local variations in conductivity in the donor and acceptor phases as well as a significant increase in photocurrent in the PTB7:ICBA sample obtained with the ternary solvent processing.« less

  15. Contact resonance atomic force microscopy imaging in air and water using photothermal excitation

    SciTech Connect (OSTI)

    Kocun, Marta; Labuda, Aleksander; Gannepalli, Anil; Proksch, Roger

    2015-08-15

    Contact Resonance Force Microscopy (CR-FM) is a leading atomic force microscopy technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been limited to imaging in air, since the “forest of peaks” frequency response associated with acoustic excitation methods effectively masks the true cantilever resonance. Using photothermal excitation results in clean contact, resonance spectra that closely match the ideal frequency response of the cantilever, allowing unambiguous and simple resonance frequency and quality factor measurements in air and liquids alike. This extends the capabilities of CR-FM to biologically relevant and other soft samples in liquid environments. We demonstrate CR-FM in air and water on both stiff silicon/titanium samples and softer polystyrene-polyethylene-polypropylene polymer samples with the quantitative moduli having very good agreement between expected and measured values.

  16. A novel self-sensing technique for tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Ruppert, Michael G.; Moheimani, S. O. Reza

    2013-12-15

    This work proposes a novel self-sensing tapping-mode atomic force microscopy operation utilizing charge measurement. A microcantilever coated with a single piezoelectric layer is simultaneously used for actuation and deflection sensing. The cantilever can be batch fabricated with existing micro electro mechanical system processes. The setup enables the omission of the optical beam deflection technique which is commonly used to measure the cantilever oscillation amplitude. Due to the high amount of capacitive feedthrough in the measured charge signal, a feedforward control technique is employed to increase the dynamic range from less than 1 dB to approximately 35 dB. Experiments show that the conditioned charge signal achieves excellent signal-to-noise ratio and can therefore be used as a feedback signal for atomic force microscopy imaging.

  17. Transient dynamics in magnetic force microscopy for a single-spin measurement

    SciTech Connect (OSTI)

    Berman, G.P.; Borgonovi, F.; Lopez, G.V.; Tsifrinovich, V.I.

    2003-07-01

    We analyze a single-spin measurement using a transient process in magnetic force microscopy which could increase the maximum operating temperature by a factor of Q (the quality factor of the cantilever) in comparison with the static Stern-Gerlach effect. We obtain an exact solution of the master equation, which confirms this result. We also discuss the conditions required to create a macroscopic quantum superposition in the cantilever.

  18. Atomic Force Microscopy Studies of Lipophosphoglycan (LPG) Molecules in Lipid Bilayers

    SciTech Connect (OSTI)

    LAST, JULIE A.; HUBER, TINA; SASAKI, DARRYL Y.; SALVATORE, BRIAN; TURCO, SALVATORE J.

    2003-03-01

    Lipophosphoglycan (LPG) is a lypopolysaccharide found on the surface of the parasite Leishmania donovani that is thought to play an essential role in the infection of humans with leishamniasis. LPG acts as an adhesion point for the parasite to the gut of the sand fly, whose bite is responsible for transmitting the disease. In addition, LPG acts to inhibit protein kinase C (PKC) in the human macrophage, possibly by structural changes in the membrane. The Ca{sup 2+} ion is believed to play a role in the infection cycle, acting both as a crosslinker between LPG molecules and by playing a part in modulating PKC activity. To gain insight into the structure of LPG within a supported lipid membrane and into the structural changes that occur due to Ca{sup 2+} ions, we have employed the atomic force microscope (AFM). We have observed that the LPG molecules inhibit bilayer fusion, resulting in bilayer islands on the mica surface. One experiment suggests that the LPG molecules are parallel to the mica surface and that the structure of the LPG changes upon addition of Ca{sup 2+}, with an increase in the height of the LPG molecules from the bilayer surface and an almost complete coverage of LPG on the bilayer island.

  19. Electric contributions to magnetic force microscopy response from graphene and MoS{sub 2} nanosheets

    SciTech Connect (OSTI)

    Li, Lu Hua Chen, Ying

    2014-12-07

    Magnetic force microscopy (MFM) signals have recently been detected from whole pieces of mechanically exfoliated graphene and molybdenum disulfide (MoS{sub 2}) nanosheets, and magnetism of the two nanomaterials was claimed based on these observations. However, non-magnetic interactions or artefacts are commonly associated with MFM signals, which make the interpretation of MFM signals not straightforward. A systematic investigation has been done to examine possible sources of the MFM signals from graphene and MoS{sub 2} nanosheets and whether the MFM signals can be correlated with magnetism. It is found that the MFM signals have significant non-magnetic contributions due to capacitive and electrostatic interactions between the nanosheets and conductive cantilever tip, as demonstrated by electric force microscopy and scanning Kevin probe microscopy analyses. In addition, the MFM signals of graphene and MoS{sub 2} nanosheets are not responsive to reversed magnetic field of the magnetic cantilever tip. Therefore, the observed MFM response is mainly from electric artefacts and not compelling enough to correlate with magnetism of graphene and MoS{sub 2} nanosheets.

  20. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    SciTech Connect (OSTI)

    Balantekin, M.; Sat?r, S.; Torello, D.; De?ertekin, F. L.

    2014-12-15

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  1. Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Mazet, Lucie; Jesse, Stephen; Niu, Gang; Schroeder, Thomas; Schamm-Chardon, Sylvie; Dubourdieu, Catherine; Baddorf, Arthur P.; Kalinin, Sergei V.; Yang, Sang Mo; Okatan, M. Baris

    2016-06-20

    Here, all scanning probe microscopies are subjected to topographic cross-talk, meaning the topography-related contrast in functional images. Here, we investigate the signatures of indirect topographic cross-talk in piezoresponse force microscopy (PFM) imaging and spectroscopy and its decoupling using band excitation (BE) method in ferroelectric BaTiO3 deposited on the Si substrates with free standing nanopillars of diameter 50 nm. Comparison between the single-frequency PFM and BE-PFM results shows that the measured signal can be significantly distorted by topography-induced shifts in the contact resonance frequency and cantilever transfer function. However, with proper correction, such shifts do not affect PFM imaging and hysteresismore » loop measurements. This suggests the necessity of an advanced approach, such as BE-PFM, for detection of intrinsic sample piezoresponse on the topographically non-uniform surfaces.« less

  2. Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging

    SciTech Connect (OSTI)

    Guo, Senli; Santiago, Solares D; Mochalin, Vadym; Neitzel, Ioannis; Gogotsi, Yury G.; Kalinin, Sergei V; Jesse, Stephen

    2012-01-01

    Force-based scanning probe microscopies have emerged as a mainstay for probing structural and mechanical properties of materials on the nanometer and molecular scales. Despite tremendous progress achieved to date, the cantilever dynamics in single frequency scanning probe microscopies (SPM) is undefined due to having only two output variables. Here we demonstrate on diamond nanoparticles with different functionalization layers that the use of broad band detection by multiple frequency SPM allows complete information on tip-surface interactions in intermittent contact SPM to be acquired. The obtained data allows sub-3nm resolution even in ambient environment. By tuning the strength of tip-surface interaction, the information on surface state can be obtained.

  3. Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits

    DOE Patents [OSTI]

    Campbell, Ann. N.; Anderson, Richard E.; Cole, Jr., Edward I.

    1995-01-01

    A magnetic force microscopy method and improved magnetic tip for detecting and quantifying internal magnetic fields resulting from current of integrated circuits. Detection of the current is used for failure analysis, design verification, and model validation. The interaction of the current on the integrated chip with a magnetic field can be detected using a cantilevered magnetic tip. Enhanced sensitivity for both ac and dc current and voltage detection is achieved with voltage by an ac coupling or a heterodyne technique. The techniques can be used to extract information from analog circuits.

  4. Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits

    DOE Patents [OSTI]

    Campbell, A.N.; Anderson, R.E.; Cole, E.I. Jr.

    1995-11-07

    A magnetic force microscopy method and improved magnetic tip for detecting and quantifying internal magnetic fields resulting from current of integrated circuits are disclosed. Detection of the current is used for failure analysis, design verification, and model validation. The interaction of the current on the integrated chip with a magnetic field can be detected using a cantilevered magnetic tip. Enhanced sensitivity for both ac and dc current and voltage detection is achieved with voltage by an ac coupling or a heterodyne technique. The techniques can be used to extract information from analog circuits. 17 figs.

  5. Conductive atomic force microscopy study of local electronic transport in ZnTe thin films

    SciTech Connect (OSTI)

    Kshirsagar, Sachin D.; Krishna, M. Ghanashyam; Tewari, Surya P.

    2013-02-05

    ZnTe thin films obtained by the electron beam evaporation technique were subjected to thermal annealing at 500 Degree-Sign C for 2 hours. The as deposited films were amorphous but transformed to the crystalline state under influence of the thermal treatment. There is increase in optical absorption due to the heat treatment caused by increase in free carrier concentration. Conductive atomic force microscopy shows the presence of electronic inhomogeneities in the films. This is attributed to local compositional variations in the films. I-V analysis in these systems indicates formation of Schottky junction at the metal semiconductor (M-S) interface.

  6. Topography and Mechanical Property Mapping of International Simple Glass Surfaces with Atomic Force Microscopy

    SciTech Connect (OSTI)

    Pierce, Eric M

    2014-01-01

    Quantitative Nanomechanical Peak Force (PF-QNM) TappingModeTM atomic force microscopy measurements are presented for the first time on polished glass surfaces. The PF-QNM technique allows for topography and mechanical property information to be measured simultaneously at each pixel. Results for the international simple glass which represents a simplified version of SON68 glass suggests an average Young s modulus of 78.8 15.1 GPa is within the experimental error of the modulus measured for SON68 glass (83.6 2 GPa) with conventional approaches. Application of the PF-QNM technique will be extended to in situ glass corrosion experiments with the goal of gaining atomic-scale insights into altered layer development by exploiting the mechanical property differences that exist between silica gel (e.g., altered layer) and pristine glass surface.

  7. Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam F.; Jesse, Stephen; Belianinov, Alex; Somnath, Suhas; Rodriguez, Brian J.; Balke, Nina; Kalinin, Sergei V.

    2016-02-11

    Since its inception over two decades ago, Kelvin probe force microscopy (KPFM) has become the standard technique for characterizing electrostatic, electrochemical and electronic properties at the nanoscale. In this work, we present a purely digital, software-based approach to KPFM utilizing big data acquisition and analysis methods. General Mode (G-Mode) KPFM, works by capturing the entire photodetector data stream, typically at the sampling rate limit, followed by subsequent de-noising, analysis and compression of the cantilever response. We demonstrate that the G-Mode approach allows simultaneous multi-harmonic detection, combined with on-the-fly transfer function correction required for quantitative CPD mapping. The KPFM approach outlinedmore » in this work significantly simplifies the technique by avoiding cumbersome instrumentation optimization steps (i.e. lock in parameters, feedback gains etc.), while also retaining the flexibility to be implemented on any atomic force microscopy platform. We demonstrate the added advantages of G-Mode KPFM by allowing simultaneous mapping of CPD and capacitance gradient (C') channels as well as increased flexibility in data exploration across frequency, time, space, and noise domains. As a result, G-Mode KPFM is particularly suitable for characterizing voltage sensitive materials or for operation in conductive electrolytes, and will be useful for probing electrodynamics in photovoltaics, liquids and ionic conductors.« less

  8. A serial-kinematic nanopositioner for high-speed atomic force microscopy

    SciTech Connect (OSTI)

    Wadikhaye, Sachin P. Yong, Yuen Kuan; Reza Moheimani, S. O.

    2014-10-15

    A flexure-guided serial-kinematic XYZ nanopositioner for high-speed Atomic Force Microscopy is presented in this paper. Two aspects influencing the performance of serial-kinematic nanopositioners are studied in this work. First, mass reduction by using tapered flexures is proposed to increased the natural frequency of the nanopositioner. 25% increase in the natural frequency is achieved due to reduced mass with tapered flexures. Second, a study of possible sensor positioning in a serial-kinematic nanopositioner is presented. An arrangement of sensors for exact estimation of cross-coupling is incorporated in the proposed design. A feedforward control strategy based on phaser approach is presented to mitigate the dynamics and nonlinearity in the system. Limitations in design approach and control strategy are discussed in the Conclusion.

  9. Atomic-force microscopy and photoluminescence of nanostructured CdTe

    SciTech Connect (OSTI)

    Babentsov, V.; Sizov, F.; Franc, J.; Luchenko, A.; Svezhentsova, E. Tsybrii, Z.

    2013-09-15

    Low-dimensional CdTe nanorods with a diameter of 10-30 nm and a high aspect ratio that reaches 100 are studied. The nanorods are grown by the physical vapor transport method with the use of Bi precipitates on the substrates. In addition, thin films of closely packed CdTe nanorods with the transverse dimensions {approx}(100-200) nm are grown. Atomic-force microscopy shows that the cross sections of all of the nanorods were hexagonally shaped. By photoluminescence measurements, the inference about the wurtzite structure of CdTe is supported, and the structural quality, electron-phonon coupling, and defects are analyzed. On the basis of recent ab initio calculations, the nature of defects responsible for the formation of deep levels in the CdTe layers and bulk crystals are analyzed.

  10. Antimicrobial properties of analgesic kyotorphin peptides unraveled through atomic force microscopy

    SciTech Connect (OSTI)

    Ribeiro, Marta M.B.; Franquelim, Henri G.; Torcato, Ines M.; Ramu, Vasanthakumar G.; Heras, Montserrat; Bardaji, Eduard R.; Castanho, Miguel A.R.B.

    2012-04-13

    Highlights: Black-Right-Pointing-Pointer New kyotorphin derivatives have antimicrobial properties against S. aureus. Black-Right-Pointing-Pointer Atomic force microscopy show membrane disturbing effects of KTP-NH{sub 2} and IbKTP-NH{sub 2}. Black-Right-Pointing-Pointer None of the KTP derivatives are hemolytic. Black-Right-Pointing-Pointer The minimal peptidic sequence with antimicrobial activity is Tyr-Arg, if amidated. -- Abstract: Antimicrobial peptides (AMPs) are promising candidates as alternatives to conventional antibiotics for the treatment of resistant pathogens. In the last decades, new AMPs have been found from the cleavage of intact proteins with no antibacterial activity themselves. Bovine hemoglobin hydrolysis, for instance, results in AMPs and the minimal antimicrobial peptide sequence was defined as Tyr-Arg plus a positively charged amino acid residue. The Tyr-Arg dipeptide alone, known as kyotorphin (KTP), is an endogenous analgesic neuropeptide but has no antimicrobial activity itself. In previous studies new KTP derivatives combining C-terminal amidation and Ibuprofen (Ib) - KTP-NH{sub 2}, IbKTP, IbKTP-NH{sub 2} - were designed in order to improve KTP brain targeting. Those modifications succeeded in enhancing peptide-cell membrane affinity towards fluid anionic lipids and higher analgesic activity after systemic injection resulted therefrom. Here, we investigated if this affinity for anionic lipid membranes also translates into antimicrobial activity because bacteria have anionic membranes. Atomic force microscopy revealed that KTP derivatives perturbed Staphylococcus aureus membrane structure by inducing membrane blebbing, disruption and lysis. In addition, these peptides bind to red blood cells but are non-hemolytic. From the KTP derivatives tested, amidated KTP proves to be the most active antibacterial agent. The combination of analgesia and antibacterial activities with absence of toxicity is highly appealing from the clinical point of view

  11. Evaluation of the electrical contact area in contact-mode scanning probe microscopy

    SciTech Connect (OSTI)

    Celano, Umberto E-mail: u.celano@gmail.com; Chintala, Ravi Chandra; Vandervorst, Wilfried; Hantschel, Thomas; Giammaria, Guido; Conard, Thierry; Bender, Hugo

    2015-06-07

    The tunneling current through an atomic force microscopy (AFM) tip is used to evaluate the effective electrical contact area, which exists between tip and sample in contact-AFM electrical measurements. A simple procedure for the evaluation of the effective electrical contact area is described using conductive atomic force microscopy (C-AFM) in combination with a thin dielectric. We characterize the electrical contact area for coated metal and doped-diamond tips operated at low force (<200 nN) in contact mode. In both cases, we observe that only a small fraction (<10?nm{sup 2}) of the physical contact (?100?nm{sup 2}) is effectively contributing to the transport phenomena. Assuming this reduced area is confined to the central area of the physical contact, these results explain the sub-10?nm electrical resolution observed in C-AFM measurements.

  12. An AFM-based pit-measuring method for indirect measurements of cell-surface membrane vesicles

    SciTech Connect (OSTI)

    Zhang, Xiaojun; Chen, Yuan; Chen, Yong

    2014-03-28

    Highlights: • Air drying induced the transformation of cell-surface membrane vesicles into pits. • An AFM-based pit-measuring method was developed to measure cell-surface vesicles. • Our method detected at least two populations of cell-surface membrane vesicles. - Abstract: Circulating membrane vesicles, which are shed from many cell types, have multiple functions and have been correlated with many diseases. Although circulating membrane vesicles have been extensively characterized, the status of cell-surface membrane vesicles prior to their release is less understood due to the lack of effective measurement methods. Recently, as a powerful, micro- or nano-scale imaging tool, atomic force microscopy (AFM) has been applied in measuring circulating membrane vesicles. However, it seems very difficult for AFM to directly image/identify and measure cell-bound membrane vesicles due to the similarity of surface morphology between membrane vesicles and cell surfaces. Therefore, until now no AFM studies on cell-surface membrane vesicles have been reported. In this study, we found that air drying can induce the transformation of most cell-surface membrane vesicles into pits that are more readily detectable by AFM. Based on this, we developed an AFM-based pit-measuring method and, for the first time, used AFM to indirectly measure cell-surface membrane vesicles on cultured endothelial cells. Using this approach, we observed and quantitatively measured at least two populations of cell-surface membrane vesicles, a nanoscale population (<500 nm in diameter peaking at ∼250 nm) and a microscale population (from 500 nm to ∼2 μm peaking at ∼0.8 μm), whereas confocal microscopy only detected the microscale population. The AFM-based pit-measuring method is potentially useful for studying cell-surface membrane vesicles and for investigating the mechanisms of membrane vesicle formation/release.

  13. Study of relaxation and transport processes by means of AFM based dielectric spectroscopy

    SciTech Connect (OSTI)

    Miccio, Luis A.

    2014-05-15

    Since its birth a few years ago, dielectric spectroscopy studies based on atomic force microscopy (AFM) have gained a growing interest. Not only the frequency and temperature ranges have become broader since then but also the kind of processes that can be studied by means of this approach. In this work we analyze the most adequate experimental setup for the study of several dielectric processes with a spatial resolution of a few nanometers by using force mode AFM based dielectric spectroscopy. Proof of concept experiments were performed on PS/PVAc blends and PMMA homopolymer films, for temperatures ranging from 300 to 400 K. Charge transport processes were also studied by this approach. The obtained results were analyzed in terms of cantilever stray contribution, film thickness and relaxation strength. We found that the method sensitivity is strongly coupled with the film thickness and the relaxation strength, and that it is possible to control it by using an adequate experimental setup.

  14. Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Balke, Nina; Kalinin, Sergei V.; Jesse, Stephen; Collins, Liam; Belianinov, Alex; Somnath, Suhas

    2016-08-12

    Kelvin probe force microscopy (KPFM) has provided deep insights into the role local electronic, ionic and electrochemical processes play on the global functionality of materials and devices, even down to the atomic scale. Conventional KPFM utilizes heterodyne detection and bias feedback to measure the contact potential difference (CPD) between tip and sample. This measurement paradigm, however, permits only partial recovery of the information encoded in bias- and time-dependent electrostatic interactions between the tip and sample and effectively down-samples the cantilever response to a single measurement of CPD per pixel. This level of detail is insufficient for electroactive materials, devices, ormore » solid-liquid interfaces, where non-linear dielectrics are present or spurious electrostatic events are possible. Here, we simulate and experimentally validate a novel approach for spatially resolved KPFM capable of a full information transfer of the dynamic electric processes occurring between tip and sample. General acquisition mode, or G-Mode, adopts a big data approach utilising high speed detection, compression, and storage of the raw cantilever deflection signal in its entirety at high sampling rates (> 4 MHz), providing a permanent record of the tip trajectory. We develop a range of methodologies for analysing the resultant large multidimensional datasets involving classical, physics-based and information-based approaches. Physics-based analysis of G-Mode KPFM data recovers the parabolic bias dependence of the electrostatic force for each cycle of the excitation voltage, leading to a multidimensional dataset containing spatial and temporal dependence of the CPD and capacitance channels. We use multivariate statistical methods to reduce data volume and separate the complex multidimensional data sets into statistically significant components that can then be mapped onto separate physical mechanisms. Overall, G-Mode KPFM offers a new paradigm to study

  15. Identifying ferroelectric phase and domain structure using angle-resolved piezoresponse force microscopy

    SciTech Connect (OSTI)

    Kim, K. L.; Huber, J. E.

    2014-03-24

    We used angle-resolved piezoresponse force microscopy (AR-PFM), vertical PFM (VPFM), and electron backscatter diffraction (EBSD) to provide a systematic interpretation of domain patterns in polycrystalline, near-morphotropic lead zirconate titanate. This material was used to illustrate the power of AR-PFM methods in resolving complex domain patterns where multiple phases may be present. AR-PFM was carried out with a 30° rotation interval, and the resulting data were analysed to identify the orientation of the underlying axis of piezoelectricity. The additional information provided by AR-PFM was studied, comparing its capabilities to those of 3-dimensional PFM, consisting of one VPFM image and two orthogonal lateral PFM (LPFM) images. We show that, in certain conditions, using AR-PFM can identify the phases present at the sub-grain scale. This was confirmed using VPFM and EBSD data. Furthermore, the method can discriminate laminated domain patterns that appear similar in VPFM and can reliably expose domain patterns that may not be seen in LPFM data from a single orientation, or even in 3D PFM data.

  16. Gaussian approximation and single-spin measurement in magnetic resonance force microscopy with spin noise

    SciTech Connect (OSTI)

    Raghunathan, Shesha; Brun, Todd A.; Goan, Hsi-Sheng

    2010-11-15

    A promising technique for measuring single electron spins is magnetic resonance force microscopy (MRFM), in which a microcantilever with a permanent magnetic tip is resonantly driven by a single oscillating spin. The most effective experimental technique is the oscillating cantilever-driven adiabatic reversals (OSCAR) protocol, in which the signal takes the form of a frequency shift. If the quality factor of the cantilever is high enough, this signal will be amplified over time to the point where it can be detected by optical or other techniques. An important requirement, however, is that this measurement process occurs on a time scale that is short compared to any noise which disturbs the orientation of the measured spin. We describe a model of spin noise for the MRFM system and show how this noise is transformed to become time dependent in going to the usual rotating frame. We simplify the description of the cantilever-spin system by approximating the cantilever wave function as a Gaussian wave packet and show that the resulting approximation closely matches the full quantum behavior. We then examine the problem of detecting the signal for a cantilever with thermal noise and spin with spin noise, deriving a condition for this to be a useful measurement.

  17. Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D Mapping of Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials

    SciTech Connect (OSTI)

    Solares, Santiago D.

    2015-09-18

    This project focused on the development of single-pass multifrequency atomic force microscopy methods for the rapid multi-function nanoscale characterization of energy-relevant materials.

  18. Piezoelectricity and ferroelectricity of cellular polypropylene electrets films characterized by piezoresponse force microscopy

    SciTech Connect (OSTI)

    Miao, Hongchen; Sun, Yao; Zhou, Xilong; Li, Yingwei; Li, Faxin

    2014-08-14

    Cellular electrets polymer is a new ferroelectret material exhibiting large piezoelectricity and has attracted considerable attentions in researches and industries. Property characterization is very important for this material and current investigations are mostly on macroscopic properties. In this work, we conduct nanoscale piezoelectric and ferroelectric characterizations of cellular polypropylene (PP) films using piezoresponse force microscopy (PFM). First, both the single-frequency PFM and dual-frequency resonance-tracking PFM testings were conducted on the cellular PP film. The localized piezoelectric constant d{sub 33} is estimated to be 7–11pC/N by correcting the resonance magnification with quality factor and it is about one order lower than the macroscopic value. Next, using the switching spectroscopy PFM (SS-PFM), we studied polarization switching behavior of the cellular PP films. Results show that it exhibits the typical ferroelectric-like phase hysteresis loops and butterfly-shaped amplitude loops, which is similar to that of a poly(vinylidene fluoride) (PVDF) ferroelectric polymer film. However, both the phase and amplitude loops of the PP film are intensively asymmetric, which is thought to be caused by the nonzero remnant polarization after poling. Then, the D-E hysteresis loops of both the cellular PP film and PVDF film were measured by using the same wave form as that used in the SS-PFM, and the results show significant differences. Finally, we suggest that the ferroelectric-like behavior of cellular electrets films should be distinguished from that of typical ferroelectrics, both macroscopically and microscopically.

  19. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun; Ogletree, D. Frank; Salmeron, Miguel; Xiao, Xudong

    1999-01-01

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  20. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

    1999-03-09

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

  1. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

    1998-04-28

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

  2. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun; Ogletree, D. Frank; Salmeron, Miguel; Xiao, Xudong

    1998-01-01

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  3. Versatile atomic force microscopy setup combined with micro-focused X-ray beam

    SciTech Connect (OSTI)

    Slobodskyy, T. Tholapi, R.; Liefeith, L.; Hansen, W.; Zozulya, A. V. Fester, M.; Sprung, M.

    2015-06-15

    Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.

  4. Probing the elastic response of microalga Scenedesmus dimorphus in dry and aqueous environments through atomic force microscopy

    SciTech Connect (OSTI)

    Warren, K. M.; Mpagazehe, J. N.; Higgs, C. F. E-mail: higgs@andrew.cmu.edu; LeDuc, P. R. E-mail: higgs@andrew.cmu.edu

    2014-10-20

    With the re-emergence of microalgae as a replacement feedstock for petroleum-derived oils, researchers are working to understand its chemical and mechanical behavior. In this work, the mechanical properties of microalgae, Scenedesmus dimorphus, were investigated at the subcellular level to determine the elastic response of cells that were in an aqueous and dried state using nano-scale indentation through atomic force microscopy. The elastic modulus of single-celled S. dimorphus cells increased over tenfold from an aqueous state to a dried state, which allows us to better understand the biophysical response of microalgae to stress.

  5. Atomic force microscopy and x-ray photoelectron spectroscopy investigations of the morphology and chemistry of a PdCl{sub 2}/SnCl{sub 2} electroless plating catalysis system adsorbed onto shape memory alloy particles

    SciTech Connect (OSTI)

    Silvain, J.F.; Fouassier, O.; Lescaux, S.

    2004-11-01

    A study of the different stages of the electroless deposition of copper on micronic NiTi shape memory alloy particles activated by one-step and two-step methods has been conducted from both a chemical and a morphological point of view. The combination of x-ray photoelectron spectroscopy (XPS) measurements and atomic force microscopy (AFM) imaging has allowed detection of the distribution of the formed compounds and depth quantification and estimation of the surface topographic parameters. For the two-step method, at the sensitization of the early stages, it is observed by AFM that Sn is absorbed in form of clusters that tend to completely cover the surface and form a continuous film. XPS analysis have shown that Sn and Pd are first absorbed in form of oxide (SnO{sub 2} and PdO) and hydroxide [Sn(OH){sub 4}]. After the entire sensitization step, the NiTi substrate is covered with Sn-based compounds. After the sensitization and the activation steps the powder roughness increases. Behavior of the Sn and Pd growth for the one-step method does not follow the behavior found for the two-step method. Indeed, XPS analysis shows a three-dimensional (3D) growth of Pd clusters on top of a mixture of metallic tin, oxide (SnO) and hydroxide [Sn(OH){sub 2}]. These Pd clusters are covered with a thin layer of Pd-oxide contamination induced by the electroless process. The mean roughness for the one-step and two-step processes are equivalent. After copper deposition, the decrease of mean roughness is attributed to a filling of surface valleys, observed after the Sn-Pd coating step.

  6. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect (OSTI)

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  7. AFM report to Coastline Optic

    SciTech Connect (OSTI)

    Brejnholt, Nicolai F.

    2015-06-26

    This report briefly outlines results from AFM on Coastline plano-plano fused silica substrate serial number 1.0-FS-PL-3356 to establish if high spatial frequency roughness meets requirements.

  8. A new ion sensing deep atomic force microscope

    SciTech Connect (OSTI)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  9. Micro- and nanodomain imaging in uniaxial ferroelectrics: Joint application of optical, confocal Raman, and piezoelectric force microscopy

    SciTech Connect (OSTI)

    Shur, V. Ya. Zelenovskiy, P. S.

    2014-08-14

    The application of the most effective methods of the domain visualization in model uniaxial ferroelectrics of lithium niobate (LN) and lithium tantalate (LT) family, and relaxor strontium-barium niobate (SBN) have been reviewed in this paper. We have demonstrated the synergetic effect of joint usage of optical, confocal Raman, and piezoelectric force microscopies which provide extracting of the unique information about formation of the micro- and nanodomain structures. The methods have been applied for investigation of various types of domain structures with increasing complexity: (1) periodical domain structure in LN and LT, (2) nanodomain structures in LN, LT, and SBN, (3) nanodomain structures in LN with modified surface layer, (4) dendrite domain structure in LN. The self-assembled appearance of quasi-regular nanodomain structures in highly non-equilibrium switching conditions has been considered.

  10. A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy

    SciTech Connect (OSTI)

    Mullin, Nic Hobbs, Jamie K.

    2014-11-15

    Calibration of lateral forces and displacements has been a long standing problem in lateral force microscopies. Recently, it was shown by Wagner et al. that the thermal noise spectrum of the first torsional mode may be used to calibrate the deflection sensitivity of the detector. This method is quick, non-destructive and may be performed in situ in air or liquid. Here we make a full quantitative comparison of the lateral inverse optical lever sensitivity obtained by the lateral thermal noise method and the shape independent method developed by Anderson et al. We find that the thermal method provides accurate results for a wide variety of rectangular cantilevers, provided that the geometry of the cantilever is suitable for torsional stiffness calibration by the torsional Sader method, in-plane bending of the cantilever may be eliminated or accounted for and that any scaling of the lateral deflection signal between the measurement of the lateral thermal noise and the measurement of the lateral deflection is eliminated or corrected for. We also demonstrate that the thermal method may be used to characterize the linearity of the detector signal as a function of position, and find a deviation of less than 8% for the instrument used.

  11. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    SciTech Connect (OSTI)

    Labuda, Aleksander; Proksch, Roger

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  12. Topographical and Chemical Imaging of a Phase Separated Polymer Using a Combined Atomic Force Microscopy/Infrared Spectroscopy/Mass Spectrometry Platform

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Tai, Tamin; Karácsony, Orsolya; Bocharova, Vera; Van Berkel, Gary J.; Kertesz, Vilmos

    2016-02-18

    This article describes how the use of a hybrid atomic force microscopy/infrared spectroscopy/mass spectrometry imaging platform was demonstrated for the acquisition and correlation of nanoscale sample surface topography and chemical images based on infrared spectroscopy and mass spectrometry.

  13. Direct observation of electron emission from the grain boundaries of chemical vapour deposition diamond films by tunneling atomic force microscopy

    SciTech Connect (OSTI)

    Chatterjee, Vijay; Harniman, Robert; May, Paul W.; Barhai, P. K.

    2014-04-28

    The emission of electrons from diamond in vacuum occurs readily as a result of the negative electron affinity of the hydrogenated surface due to features with nanoscale dimensions, which can concentrate electric fields high enough to induce electron emission from them. Electrons can be emitted as a result of an applied electric field (field emission) with possible uses in displays or cold-cathode devices. Alternatively, electrons can be emitted simply by heating the diamond in vacuum to temperatures as low as 350?C (thermionic emission), and this may find applications in solar energy generation or energy harvesting devices. Electron emission studies usually use doped polycrystalline diamond films deposited onto Si or metallic substrates by chemical vapor deposition, and these films have a rough, faceted morphology on the micron or nanometer scale. Electron emission is often improved by patterning the diamond surface into sharp points or needles, the idea being that the field lines concentrate at the points lowering the barrier for electron emission. However, there is little direct evidence that electrons are emitted from these sharp tips. The few reports in the literature that have studied the emission sites suggested that emission came from the grain boundaries and not the protruding regions. We now present direct observation of the emission sites over a large area of polycrystalline diamond using tunneling atomic force microscopy. We confirm that the emission current comes mostly from the grain boundaries, which is consistent with a model for emission in which the non-diamond phase is the source of electrons with a threshold that is determined by the surrounding hydrogenated diamond surface.

  14. Characterization of microscale wear in a ploysilicon-based MEMS device using AFM and PEEM-NEXAFS spectromicroscopy.

    SciTech Connect (OSTI)

    Grierson, D. S.; Konicek, A. R.; Wabiszewski, G. E.; Sumant, A. V.; de Boer, M. P.; Corwin, A. D.; Carpick, R. W. (Center for Nanoscale Materials); ( PSC-USR); (Univ. of Wisconsin at Madison); (Univ. of Pennsylvania); (SNL)

    2009-12-01

    Mechanisms of microscale wear in silicon-based microelectromechanical systems (MEMS) are elucidated by studying a polysilicon nanotractor, a device specifically designed to conduct friction and wear tests under controlled conditions. Photoelectron emission microscopy (PEEM) was combined with near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and atomic force microscopy (AFM) to quantitatively probe chemical changes and structural modification, respectively, in the wear track of the nanotractor. The ability of PEEM-NEXAFS to spatially map chemical variations in the near-surface region of samples at high lateral spatial resolution is unparalleled and therefore ideally suited for this study. The results show that it is possible to detect microscopic chemical changes using PEEM-NEXAFS, specifically, oxidation at the sliding interface of a MEMS device. We observe that wear induces oxidation of the polysilicon at the immediate contact interface, and the spectra are consistent with those from amorphous SiO{sub 2}. The oxidation is correlated with gouging and debris build-up in the wear track, as measured by AFM and scanning electron microscopy (SEM).

  15. Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

    SciTech Connect (OSTI)

    Evans, J. Chapman, S.

    2014-08-14

    Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided.

  16. Band Excitation Method Applicable to Scanning Probe Microscopy...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    force microscopy, atomic force acoustic microscopy, and piezoresponse force microscopy. It is relevant to all SPM manufacturers and can yield data about a sample's electrical, ...

  17. Two-Dimensional Measurement of n+-p Asymmetrical Junctions in Multicrystalline Silicon Solar Cells using AFM-Based Electrical Techniques with Nanometer Resolution

    SciTech Connect (OSTI)

    Jiang, C. S.; Heath, J. T.; Moutinho, H. R.; Li, J. V.; Al-Jassim, M. M.

    2011-01-01

    Lateral inhomogeneities of modern solar cells demand direct electrical imaging with nanometer resolution. We show that atomic force microscopy (AFM)-based electrical techniques provide unique junction characterizations, giving a two-dimensional determination of junction locations. Two AFM-based techniques, scanning capacitance microscopy/spectroscopy (SCM/SCS) and scanning Kelvin probe force microscopy (SKPFM), were significantly improved and applied to the junction characterizations of multicrystalline silicon (mc-Si) cells. The SCS spectra were taken pixel by pixel by precisely controlling the tip positions in the junction area. The spectra reveal distinctive features that depend closely on the position relative to the electrical junction, which allows us to indentify the electrical junction location. In addition, SKPFM directly probes the built-in potential over the junction area modified by the surface band bending, which allows us to deduce the metallurgical junction location by identifying a peak of the electric field. Our results demonstrate resolutions of 10-40 nm, depending on the techniques (SCS or SKPFM). These direct electrical measurements with nanometer resolution and intrinsic two-dimensional capability are well suited for investigating the junction distribution of solar cells with lateral inhomogeneities.

  18. Two-Dimensional Measurement of n+-p Asymmetrical Junctions in Multicrystalline Silicon Solar Cells Using AFM-Based Electrical Techniques with Nanometer Resolution: Preprint

    SciTech Connect (OSTI)

    Jiang, C. S.; Moutinho, H. R.; Li, J. V.; Al-Jassim, M. M.; Heath, J. T.

    2011-07-01

    Lateral inhomogeneities of modern solar cells demand direct electrical imaging with nanometer resolution. We show that atomic force microscopy (AFM)-based electrical techniques provide unique junction characterizations, giving a two-dimensional determination of junction locations. Two AFM-based techniques, scanning capacitance microscopy/spectroscopy (SCM/SCS) and scanning Kelvin probe force microscopy (SKPFM), were significantly improved and applied to the junction characterizations of multicrystalline silicon (mc-Si) cells. The SCS spectra were taken pixel by pixel by precisely controlling the tip positions in the junction area. The spectra reveal distinctive features that depend closely on the position relative to the electrical junction, which allows us to indentify the electrical junction location. In addition, SKPFM directly probes the built-in potential over the junction area modified by the surface band bending, which allows us to deduce the metallurgical junction location by identifying a peak of the electric field. Our results demonstrate resolutions of 10-40 nm, depending on the techniques (SCS or SKPFM). These direct electrical measurements with nanometer resolution and intrinsic two-dimensional capability are well suited for investigating the junction distribution of solar cells with lateral inhomogeneities.

  19. Nanoscale characterization of β-phase H{sub x}Li{sub 1−x}NbO{sub 3} layers by piezoresponse force microscopy

    SciTech Connect (OSTI)

    Manzo, Michele; Gallo, Katia; Denning, Denise; Rodriguez, Brian J.

    2014-08-14

    We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO{sub 3} with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d{sub 33} coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO{sub 3} value, for undoped and 5 mol. % MgO-doped substrates, respectively.

  20. Electric transport through nanometric CoFe{sub 2}O{sub 4} thin films investigated by conducting atomic force microscopy

    SciTech Connect (OSTI)

    Foerster, M.; Gutierrez, D. F.; Rigato, F.; Fontcuberta, J.; Rebled, J. M.; Peiro, F.

    2012-01-01

    A systematic study of electric transport through thin (2-8 nm) CoFe{sub 2}O{sub 4} films deposited on epitaxial SrRuO{sub 3} bottom electrodes was performed by conducting atomic force microscopy (CAFM). Experimental procedures to investigate transport through thin insulating films by CAFM are critically revised, and the potential of CoFe{sub 2}O{sub 4} films for the use as spin-filtering barriers is assessed. It is concluded that, at room-temperature, a non-tunnel channel significantly contributes to the electric transport, thus limiting the spin-filtering efficiency.

  1. AFM Imaging Reveals Topographic Diversity of Wild Type and Z Variant Polymers of Human α1-Proteinase Inhibitor

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Gaczynska, Maria; Karpowicz, Przemyslaw; Stuart, Christine E.; Norton, Malgorzata G.; Teckman, Jeffrey H.; Marszal, Ewa; Osmulski, Pawel A.

    2016-03-23

    α1-Proteinase inhibitor (antitrypsin) is a canonical example of the serpin family member that binds and inhibits serine proteases. The natural metastability of serpins is crucial to carry out structural rearrangements necessary for biological activity. However, the enhanced metastability of the mutant Z variant of antitrypsin, in addition to folding defect, may substantially contribute to its polymerization, a process leading to incurable serpinopathy. The metastability also impedes structural studies on the polymers. There are no crystal structures of Z monomer or any kind of polymers larger than engineered wild type (WT) trimer. Our understanding of polymerization mechanisms is based on biochemicalmore » data using in vitro generated WT oligomers and molecular simulations. Here we applied atomic force microscopy (AFM) to compare topography of monomers, in vitro formed WT oligomers, and Z type polymers isolated from transgenic mouse liver. We found the AFM images of monomers closely resembled an antitrypsin outer shell modeled after the crystal structure. We confirmed that the Z variant demonstrated higher spontaneous propensity to dimerize than WT monomers. We also detected an unexpectedly broad range of different types of polymers with periodicity and topography depending on the applied method of polymerization. Short linear oligomers of unit arrangement similar to the Z polymers were especially abundant in heat-treated WT preparations. Long linear polymers were a prominent and unique component of liver extracts. However, the liver preparations contained also multiple types of oligomers of topographies undistinguishable from those found inWT samples polymerized with heat, low pH or guanidine hydrochloride treatments. In conclusion, we established that AFM is an excellent technique to assess morphological diversity of antitrypsin polymers, which is important for etiology of serpinopathies. These data also support previous, but controversial models of in vivo

  2. ATOMIC FORCE LITHOGRAPHY OF NANO MICROFLUIDIC CHANNELS FOR VERIFICATION AND MONITORING IN AQUEOUS SOLUTIONS

    SciTech Connect (OSTI)

    Torres, R.; Mendez-Torres, A.; Lam, P.

    2011-06-09

    The growing interest in the physics of fluidic flow in nanoscale channels, as well as the possibility for high sensitive detection of ions and single molecules is driving the development of nanofluidic channels. The enrichment of charged analytes due to electric field-controlled flow and surface charge/dipole interactions along the channel can lead to enhancement of sensitivity and limits-of-detection in sensor instruments. Nuclear material processing, waste remediation, and nuclear non-proliferation applications can greatly benefit from this capability. Atomic force microscopy (AFM) provides a low-cost alternative for the machining of disposable nanochannels. The small AFM tip diameter (< 10 nm) can provide for features at scales restricted in conventional optical and electron-beam lithography. This work presents preliminary results on the fabrication of nano/microfluidic channels on polymer films deposited on quartz substrates by AFM lithography.

  3. ATOMIC FORCE LITHOGRAPHY OF NANO/MICROFLUIDIC CHANNELS FOR VERIFICATION AND MONITORING OF AQUEOUS SOLUTIONS

    SciTech Connect (OSTI)

    Mendez-Torres, A.; Torres, R.; Lam, P.

    2011-07-15

    The growing interest in the physics of fluidic flow in nanoscale channels, as well as the possibility for high sensitive detection of ions and single molecules is driving the development of nanofluidic channels. The enrichment of charged analytes due to electric field-controlled flow and surface charge/dipole interactions along the channel can lead to enhancement of sensitivity and limits-of-detection in sensor instruments. Nuclear material processing, waste remediation, and nuclear non-proliferation applications can greatly benefit from this capability. Atomic force microscopy (AFM) provides a low-cost alternative for the machining of disposable nanochannels. The small AFM tip diameter (< 10 nm) can provide for features at scales restricted in conventional optical and electron-beam lithography. This work presents preliminary results on the fabrication of nano/microfluidic channels on polymer films deposited on quartz substrates by AFM lithography.

  4. Atomic Force Microscope

    SciTech Connect (OSTI)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  5. Potential variation around grain boundaries in BaSi{sub 2} films grown on multicrystalline silicon evaluated using Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Baba, Masakazu; Tsukahara, Daichi; Toko, Kaoru; Hara, Kosuke O.; Usami, Noritaka; Sekiguchi, Takashi; Suemasu, Takashi

    2014-12-21

    Potential variations across the grain boundaries (GBs) in a 100?nm thick undoped n-BaSi{sub 2} film on a cast-grown multicrystalline Si (mc-Si) substrate are evaluated using Kelvin probe force microscopy (KFM). The ?-2? X-ray diffraction pattern reveals diffraction peaks, such as (201), (301), (410), and (411) of BaSi{sub 2}. Local-area electron backscatter diffraction reveals that the a-axis of BaSi{sub 2} is tilted slightly from the surface normal, depending on the local crystal plane of the mc-Si. KFM measurements show that the potentials are not significantly disordered in the grown BaSi{sub 2}, even around the GBs of mc-Si. The potentials are higher at GBs of BaSi{sub 2} around Si GBs that are formed by grains with a Si(111) face and those with faces that deviate slightly from Si(111). Thus, downward band bending occurs at these BaSi{sub 2} GBs. Minority carriers (holes) undergo a repelling force near the GBs, which may suppress recombination as in the case of undoped n-BaSi{sub 2} epitaxial films on a single crystal Si(111) substrate. The barrier height for hole transport across the GBs varies in the range from 10 to 55?meV. The potentials are also higher at the BaSi{sub 2} GBs grown around Si GBs composed of grains with Si(001) and Si(111) faces. The barrier height for hole transport ranges from 5 to 55?meV. These results indicate that BaSi{sub 2} GBs formed on (111)-dominant Si surfaces do not have a negative influence on the minority-carrier properties, and thus BaSi{sub 2} formed on underlayers, such as (111)-oriented Si or Ge and on (111)-oriented mc-Si, can be utilized as a solar cell active layer.

  6. Dynamic force spectroscopy of parallel individual mucin1-antibody bonds

    SciTech Connect (OSTI)

    Sulchek, T A; Friddle, R W; Langry, K; Lau, E; Albrecht, H; Ratto, T; DeNardo, S; Colvin, M E; Noy, A

    2005-05-02

    We used atomic force microscopy (AFM) to measure the binding forces between Mucin1 (MUC1) peptide and a single chain antibody fragment (scFv) selected from a scFv library screened against MUC1. This binding interaction is central to the design of the molecules for targeted delivery of radioimmunotherapeutic agents for prostate and breast cancer treatment. Our experiments separated the specific binding interaction from non-specific interactions by tethering the antibody and MUC1 molecules to the AFM tip and sample surface with flexible polymer spacers. Rupture force magnitude and elastic characteristics of the spacers allowed identification of the bond rupture events corresponding to different number of interacting proteins. We used dynamic force spectroscopy to estimate the intermolecular potential widths and equivalent thermodynamic off rates for mono-, bi-, and tri-valent interactions. Measured interaction potential parameters agree with the results of molecular docking simulation. Our results demonstrate that an increase of the interaction valency leads to a precipitous decline in the dissociation rate. Binding forces measured for mono and multivalent interactions match the predictions of a Markovian model for the strength of multiple uncorrelated bonds in parallel configuration. Our approach is promising for comparison of the specific effects of molecular modifications as well as for determination of the best configuration of antibody-based multivalent targeting agents.

  7. Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform

    SciTech Connect (OSTI)

    Ovchinnikova, Olga S.; Tai, Tamin; Bocharova, Vera; Okatan, Mahmut Baris; Belianinov, Alex; Kertesz, Vilmos; Jesse, Stephen; Van Berkel, Gary J.

    2015-03-18

    The advancement of a hybrid atomic force microscopy/mass spectrometry imaging platform demonstrating for the first time co-registered topographical, band excitation nanomechanical, and mass spectral imaging of a surface using a single instrument is reported. The mass spectrometry-based chemical imaging component of the system utilized nanothermal analysis probes for pyrolytic surface sampling followed by atmospheric pressure chemical ionization of the gas phase species produced with subsequent mass analysis. We discuss the basic instrumental setup and operation and the multimodal imaging capability and utility are demonstrated using a phase separated polystyrene/poly(2-vinylpyridine) polymer blend thin film. The topography and band excitation images showed that the valley and plateau regions of the thin film surface were comprised primarily of one of the two polymers in the blend with the mass spectral chemical image used to definitively identify the polymers at the different locations. Data point pixel size for the topography (390 nm x 390 nm), band excitation (781 nm x 781 nm), mass spectrometry (690 nm x 500 nm) images was comparable and submicrometer in all three cases, but the data voxel size for each of the three images was dramatically different. The topography image was uniquely a surface measurement, whereas the band excitation image included information from an estimated 10 nm deep into the sample and the mass spectral image from 110-140 nm in depth. Moreover, because of this dramatic sampling depth variance, some differences in the band excitation and mass spectrometry chemical images were observed and were interpreted to indicate the presence of a buried interface in the sample. The spatial resolution of the mass spectral image was estimated to be between 1.5 m 2.6 m, based on the ability to distinguish surface features in that image that were also observed in the other images.

  8. Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ovchinnikova, Olga S.; Tai, Tamin; Bocharova, Vera; Okatan, Mahmut Baris; Belianinov, Alex; Kertesz, Vilmos; Jesse, Stephen; Van Berkel, Gary J.

    2015-03-18

    The advancement of a hybrid atomic force microscopy/mass spectrometry imaging platform demonstrating for the first time co-registered topographical, band excitation nanomechanical, and mass spectral imaging of a surface using a single instrument is reported. The mass spectrometry-based chemical imaging component of the system utilized nanothermal analysis probes for pyrolytic surface sampling followed by atmospheric pressure chemical ionization of the gas phase species produced with subsequent mass analysis. We discuss the basic instrumental setup and operation and the multimodal imaging capability and utility are demonstrated using a phase separated polystyrene/poly(2-vinylpyridine) polymer blend thin film. The topography and band excitation images showedmore » that the valley and plateau regions of the thin film surface were comprised primarily of one of the two polymers in the blend with the mass spectral chemical image used to definitively identify the polymers at the different locations. Data point pixel size for the topography (390 nm x 390 nm), band excitation (781 nm x 781 nm), mass spectrometry (690 nm x 500 nm) images was comparable and submicrometer in all three cases, but the data voxel size for each of the three images was dramatically different. The topography image was uniquely a surface measurement, whereas the band excitation image included information from an estimated 10 nm deep into the sample and the mass spectral image from 110-140 nm in depth. Moreover, because of this dramatic sampling depth variance, some differences in the band excitation and mass spectrometry chemical images were observed and were interpreted to indicate the presence of a buried interface in the sample. The spatial resolution of the mass spectral image was estimated to be between 1.5 m 2.6 m, based on the ability to distinguish surface features in that image that were also observed in the other images.« less

  9. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect (OSTI)

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanners fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the ?{sub 3}?{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ?7 frames/s.

  10. High-speed atomic force microscope based on an astigmatic detection system

    SciTech Connect (OSTI)

    Liao, H.-S.; Chen, Y.-H.; Hwu, E.-T.; Chang, C.-S.; Hwang, I.-S.; Ding, R.-F.; Huang, H.-F.; Wang, W.-M.; Huang, K.-Y.

    2014-10-15

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  11. Parametric effects in nanobeams and AFM

    SciTech Connect (OSTI)

    Claeyssen, J. C. R.; Tonetto, L.; Carvalho, J. B.; Copetti, R. D.

    2014-12-10

    Vibration dynamics of forced cantilever beams that are used in nanotechnology such as atomic force microscope modeling and carbon nanotubes is considered in terms of a fundamental response within a matrix framework. The modeling equations are written as a matrix differential equation subject to tip-sample general boundary conditions. At the junctions, where there are discontinuities due to different material or beam thickness, compatibility conditions are prescribed. Forced responses are given by convolution of the input load with the time domain Green matrix function. The corresponding matrix transfer function and modes of a multispan cantilever beam are determined in terms of solution basis of the same shape generated by a fundamental solution. Simulations were performed for a three stepped beam with a piezoelectric patch subject to pulse forcing terms and with surface effects.

  12. Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis

    SciTech Connect (OSTI)

    Wirtz, Tom; Fleming, Yves; Gerard, Mathieu; Gysin, Urs; Glatzel, Thilo; Meyer, Ernst; Wegmann, Urs; Maier, Urs; Odriozola, Aitziber Herrero; Uehli, Daniel

    2012-06-15

    State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical mappings with excellent sensitivity and spatial resolution. Several important artifacts however arise from the fact that SIMS 3D mapping does not take into account the surface topography of the sample. In order to correct these artifacts, we have integrated a specially developed scanning probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new high-precision sample stage, a scanner with a range of 100 {mu}m in x and y direction, and a dedicated SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy modes. Topographical information gained from AFM measurements taken before, during, and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D reconstruction using the software program 'SARINA,' which was developed for this first combined SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMS-SPM approach.

  13. Low-temperature evolution of local polarization properties of PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} thin films probed by piezoresponse force microscopy

    SciTech Connect (OSTI)

    Andreeva, N. V.; Filimonov, A. V.; Rudskoy, A. I.; Tyunina, M.; Pertsev, N. A. Vakhrushev, S. B.

    2014-03-17

    The temperature evolution of local polarization properties in epitaxial PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} films is studied by the low-temperature piezoresponse force microscopy (PFM). Pronounced changes in the film polarization state, including apparent polarization rotations and possible transitions between single-domain and polydomain states of individual ferroelectric nanocolumns, are revealed on cooling from the room temperature to 8?K using PFM imaging. More than two-fold increase in the coercive voltage extracted from the piezoresponse hysteresis loops is found on cooling from 240 to 8?K. The results are explained by the thermodynamic theory of strained epitaxial perovskite ferroelectric films.

  14. True atomic-scale imaging of a spinel Li{sub 4}Ti{sub 5}O{sub 12}(111) surface in aqueous solution by frequency-modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kitta, Mitsunori, E-mail: m-kitta@aist.go.jp; Kohyama, Masanori [Research Institute for Ubiquitous Energy Devices, National Institute of Advanced Industrial Science and Technology, 1-8-31 Midorigaoka, Ikeda, Osaka 563-8577 (Japan); Onishi, Hiroshi [Department of Chemistry, Graduate School of Science, Kobe University 1-1 Rokkodai, Nada, Kobe 657-8501 (Japan)

    2014-09-15

    Spinel-type lithium titanium oxide (LTO; Li{sub 4}Ti{sub 5}O{sub 12}) is a negative electrode material for lithium-ion batteries. Revealing the atomic-scale surface structure of LTO in liquid is highly necessary to investigate its surface properties in practical environments. Here, we reveal an atomic-scale image of the LTO(111) surface in LiCl aqueous solution using frequency-modulation atomic force microscopy. Atomically flat terraces and single steps having heights of multiples of 0.5?nm were observed in the aqueous solution. Hexagonal bright spots separated by 0.6?nm were also observed on the flat terrace part, corresponding to the atomistic contrast observed in the ultrahigh vacuum condition, which suggests that the basic atomic structure of the LTO(111) surface is retained without dramatic reconstruction even in the aqueous solution.

  15. Domain Dynamics in Piezoresponse Force Microscopy: Quantitative...

    Office of Scientific and Technical Information (OSTI)

    The fine structure of the hysteresis loop is shown to be related to the observed jumps in the domain geometry during domain wall propagation (nanoscale Barkhausen jumps), ...

  16. Domain formation and polarization reversal under atomic force microscopy-tip voltages in ion-sliced LiNbO{sub 3} films on SiO{sub 2}/LiNbO{sub 3} substrates

    SciTech Connect (OSTI)

    Gainutdinov, R. V.; Volk, T. R.; Zhang, H. H.

    2015-10-19

    We report on studies on writing of micro- and nanodomains and specified domain patterns by AFM-tip voltages U{sub DC} in thin (0.5 μm thick) ion-sliced LiNbO{sub 3} films embedded to SiO{sub 2}/LiNbO{sub 3} substrates. A peculiar feature is an overlapping of domains as the distance between them decreases. Piezoelectric hysteresis loops were measured in a wide range of U{sub DC} pulse durations. Domain dynamics and characteristics of hysteresis loops reveal marked distinctions from those observed so far in LiNbO{sub 3} films and bulk crystals.

  17. Electron Microscopy Center

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Argonne Home > EMC > EMC Home Electron Microscopy Center Web Site has moved This page has moved to http:www.anl.govcnmgroupelectron-microscopy-cente...

  18. protective force

    National Nuclear Security Administration (NNSA)

    ntex%20-%20protective%20force%20-%20edited.jpg" alt"successfully completed a recent assessment by the U.S. Department " >

    Members of Pantex's Protective Force on...

  19. A metrological large range atomic force microscope with improved performance

    SciTech Connect (OSTI)

    Dai, Gaoliang; Wolff, Helmut; Pohlenz, Frank; Danzebrink, Hans-Ulrich

    2009-04-15

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument.

  20. air force

    National Nuclear Security Administration (NNSA)

    en NNSA, Air Force Complete Successful B61-12 Life Extension Program Development Flight Test at Tonopah Test Range http:nnsa.energy.govmediaroompressreleases...

  1. Mapping site-specific endonuclease binding to DNA by direct imaging with AFM

    SciTech Connect (OSTI)

    Allison, D.P.; Thundat, T.; Doktycz, M.J.; Kerper, P.S.; Warmack, R.J.; Modrich, P.; Isfort, R.J.

    1995-12-31

    Physical mapping of DNA can be accomplished by direct AFM imaging of site specific proteins bound to DNA molecules. Using Gln-111, a mutant of EcoRI endonuclease with a specific affinity for EcoRI sites 1,000 times greater than wild type enzyme but with cleavage rate constants reduced by a factor of 10{sup 4}, the authors demonstrate site-specific mapping by direct AFM imaging. Images are presented showing specific-site binding of Gln-111 to plasmids having either one (pBS{sup +}) or two (pMP{sup 32}) EcoRI sites. Identification of the Gln-111/DNA complex is greatly enhanced by biotinylation of the complex followed by reaction with streptavidin gold prior to imaging. Image enhancement coupled with improvements in the preparation techniques for imaging large DNA molecules, such as lambda DNA (47 kb), has the potential to contribute to direct AFM restriction mapping of cosmid-sized genomic DNAs.

  2. Hyperbaric Hydrothermal Atomic Force Microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2003-07-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  3. Hyperbaric hydrothermal atomic force microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2002-01-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  4. Force sensor

    DOE Patents [OSTI]

    Grahn, A.R.

    1993-05-11

    A force sensor and related method for determining force components is described. The force sensor includes a deformable medium having a contact surface against which a force can be applied, a signal generator for generating signals that travel through the deformable medium to the contact surface, a signal receptor for receiving the signal reflected from the contact surface, a generation controller, a reception controller, and a force determination apparatus. The signal generator has one or more signal generation regions for generating the signals. The generation controller selects and activates the signal generation regions. The signal receptor has one or more signal reception regions for receiving signals and for generating detections signals in response thereto. The reception controller selects signal reception regions and detects the detection signals. The force determination apparatus measures signal transit time by timing activation and detection and, optionally, determines force components for selected cross-field intersections. The timer which times by activation and detection can be any means for measuring signal transit time. A cross-field intersection is defined by the overlap of a signal generation region and a signal reception region.

  5. Force sensor

    DOE Patents [OSTI]

    Grahn, Allen R.

    1993-01-01

    A force sensor and related method for determining force components. The force sensor includes a deformable medium having a contact surface against which a force can be applied, a signal generator for generating signals that travel through the deformable medium to the contact surface, a signal receptor for receiving the signal reflected from the contact surface, a generation controller, a reception controller, and a force determination apparatus. The signal generator has one or more signal generation regions for generating the signals. The generation controller selects and activates the signal generation regions. The signal receptor has one or more signal reception regions for receiving signals and for generating detections signals in response thereto. The reception controller selects signal reception regions and detects the detection signals. The force determination apparatus measures signal transit time by timing activation and detection and, optionally, determines force components for selected cross-field intersections. The timer which times by activation and detection can be any means for measuring signal transit time. A cross-field intersection is defined by the overlap of a signal generation region and a signal reception region.

  6. Controlled nanopatterning of a polymerized ionic liquid in a...

    Office of Scientific and Technical Information (OSTI)

    force microscopy (AFM), are versatile tools for creating nanoscale patterns utilizing a range of physical stimuli such as force, heat, or electric field confined to the nanoscale. ...

  7. Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2005-08-26

    Establishes requirements for management and operation of the DOE Protective Force (PF), establishes requirements for firearms operations and defines the firearms courses of fire. Cancels: DOE M 473.2-1A DOE M 473.2-2

  8. Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2006-03-07

    The manual establishes requirements for management and operation of the DOE Protective Force, establishes requirements for firearms operations and defines the firearms courses of fire. Chg 1 dated 3/7/06. DOE M 470.4-3A cancels DOE M 470.4-3, Chg 1, Protective Force, dated 3-7-06, Attachment 2, Contractor Requirement Document (CRD) only (except for Section C). Chg 1, dated 3-7-06, cancels DOE M 470.4-3

  9. An improved proximity force approximation for electrostatics

    SciTech Connect (OSTI)

    Fosco, Cesar D.; Instituto Balseiro, Universidad Nacional de Cuyo, R8402AGP Bariloche ; Lombardo, Fernando C.; IFIBA ; Mazzitelli, Francisco D.

    2012-08-15

    A quite straightforward approximation for the electrostatic interaction between two perfectly conducting surfaces suggests itself when the distance between them is much smaller than the characteristic lengths associated with their shapes. Indeed, in the so called 'proximity force approximation' the electrostatic force is evaluated by first dividing each surface into a set of small flat patches, and then adding up the forces due two opposite pairs, the contributions of which are approximated as due to pairs of parallel planes. This approximation has been widely and successfully applied in different contexts, ranging from nuclear physics to Casimir effect calculations. We present here an improvement on this approximation, based on a derivative expansion for the electrostatic energy contained between the surfaces. The results obtained could be useful for discussing the geometric dependence of the electrostatic force, and also as a convenient benchmark for numerical analyses of the tip-sample electrostatic interaction in atomic force microscopes. - Highlights: Black-Right-Pointing-Pointer The proximity force approximation (PFA) has been widely used in different areas. Black-Right-Pointing-Pointer The PFA can be improved using a derivative expansion in the shape of the surfaces. Black-Right-Pointing-Pointer We use the improved PFA to compute electrostatic forces between conductors. Black-Right-Pointing-Pointer The results can be used as an analytic benchmark for numerical calculations in AFM. Black-Right-Pointing-Pointer Insight is provided for people who use the PFA to compute nuclear and Casimir forces.

  10. Photothermal imaging scanning microscopy

    DOE Patents [OSTI]

    Chinn, Diane; Stolz, Christopher J.; Wu, Zhouling; Huber, Robert; Weinzapfel, Carolyn

    2006-07-11

    Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.

  11. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2006-08-22

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  12. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V.; Wang, Chengpu

    2004-11-16

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  13. Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D...

    Office of Scientific and Technical Information (OSTI)

    Materials This project focused on the development of single-pass multifrequency atomic ... Country of Publication: United States Language: English Subject: 77 NANOSCIENCE AND ...

  14. Customized atomic force microscopy probe by focused-ion-beam...

    Office of Scientific and Technical Information (OSTI)

    Department of Pediatrics, Division of Immunology, Allergy and Rheumatology, Stanford ... OSTI Identifier: 22314503 Resource Type: Journal Article Resource Relation: Journal Name: ...

  15. Mode synthesizing atomic force microscopy and mode-synthesizing sensing

    DOE Patents [OSTI]

    Passian, Ali; Thundat, Thomas George; Tetard, Laurene

    2013-05-17

    A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.

  16. Nonlinear vibrational microscopy

    DOE Patents [OSTI]

    Holtom, Gary R.; Xie, Xiaoliang Sunney; Zumbusch, Andreas

    2000-01-01

    The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. Microscopic imaging with a vibrational spectroscopic contrast is achieved by generating signals in a nonlinear optical process and spatially resolved detection of the signals. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a. directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b. collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c. removing the residual beam; and d. detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution then IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers. CARS and SFG microscopy does not rely on the presence of fluorophores, but retains the resolution and three-dimensional sectioning capability of confocal and two-photon fluorescence microscopy. Complementary to these techniques, CARS and SFG microscopy provides a contrast mechanism based on vibrational spectroscopy. This vibrational contrast mechanism, combined with an unprecedented high sensitivity at a tolerable laser power level, provides a new approach for microscopic investigations of chemical and biological samples.

  17. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties

    SciTech Connect (OSTI)

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-15

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  18. Lift Forces

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lift Forces in Bubbly Flows Thomas Daly ∗ , Sreekanth Pannala † , Arthur Ruggles ∗ ∗ Department of Nuclear Engineering, University of Tennessee, 315 Pasqua Engineering Building, Knoxville, TN, 37996-2300 † Oak Ridge National Laboratory, P.O. Box 2008, Bldg. 5700, MS 6164 Oak Ridge, TN 37831-6164 tdaly1@utk.edu, pannalas@ornl.gov, aruggles@utk.edu INTRODUCTION Multiphase flows are found in a variety of engineering systems, two of the most notable categories being energy pro- duction and

  19. Dynamic Transmission Electron Microscopy

    SciTech Connect (OSTI)

    Evans, James E.; Jungjohann, K. L.; Browning, Nigel D.

    2012-10-12

    Dynamic transmission electron microscopy (DTEM) combines the benefits of high spatial resolution electron microscopy with the high temporal resolution of ultrafast lasers. The incorporation of these two components into a single instrument provides a perfect platform for in situ observations of material processes. However, previous DTEM applications have focused on observing structural changes occurring in samples exposed to high vacuum. Therefore, in order to expand the pump-probe experimental regime to more natural environmental conditions, in situ gas and liquid chambers must be coupled with Dynamic TEM. This chapter describes the current and future applications of in situ liquid DTEM to permit time-resolved atomic scale observations in an aqueous environment, Although this chapter focuses mostly on in situ liquid imaging, the same research potential exists for in situ gas experiments and the successful integration of these techniques promises new insights for understanding nanoparticle, catalyst and biological protein dynamics with unprecedented spatiotemporal resolution.

  20. Fourier plane imaging microscopy

    SciTech Connect (OSTI)

    Dominguez, Daniel Peralta, Luis Grave de; Alharbi, Nouf; Alhusain, Mdhaoui; Bernussi, Ayrton A.

    2014-09-14

    We show how the image of an unresolved photonic crystal can be reconstructed using a single Fourier plane (FP) image obtained with a second camera that was added to a traditional compound microscope. We discuss how Fourier plane imaging microscopy is an application of a remarkable property of the obtained FP images: they contain more information about the photonic crystals than the images recorded by the camera commonly placed at the real plane of the microscope. We argue that the experimental results support the hypothesis that surface waves, contributing to enhanced resolution abilities, were optically excited in the studied photonic crystals.

  1. Probing graphene defects and estimating graphene quality with optical microscopy

    SciTech Connect (OSTI)

    Lai, Shen; Kyu Jang, Sung; Jae Song, Young; Lee, Sungjoo

    2014-01-27

    We report a simple and accurate method for detecting graphene defects that utilizes the mild, dry annealing of graphene/Cu films in air. In contrast to previously reported techniques, our simple approach with optical microscopy can determine the density and degree of dislocation of defects in a graphene film without inducing water-related damage or functionalization. Scanning electron microscopy, confocal Raman and atomic force microscopy, and X-ray photoelectron spectroscopy analysis were performed to demonstrate that our nondestructive approach to characterizing graphene defects with optimized thermal annealing provides rapid and comprehensive determinations of graphene quality.

  2. Direct-Write of Silicon and Germanium Nanostructures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    deliver desired stimuli or chemicals to a small area of a sample surface. Specifically, atomic force microscopy (AFM) has been employed in several nanofabrication schemes....

  3. News Item

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    interpretation of AFM data acquired during analysis. Scientific Achievement Using in-situ Atomic Force Microscopy to directly observe S-layer formation on mica chips, Foundry...

  4. Lattice accommodation of epitaxial Bi(111) films on Si(001) studied with SPA-LEED and AFM

    SciTech Connect (OSTI)

    Jnawali, G.; Hattab, H.; Krenzer, B.; Horn von Hoegen, M.

    2006-11-15

    The growth of Bi on a Si(001) surface is studied in situ by spot profile analyzing low-energy electron diffraction and ex situ by atomic force microscopy. A continuous epitaxial Bi(111) film with a thickness of 6 nm is grown at 150 K in a bilayer growth mode. During annealing to 450 K the lattice mismatch between Si(001) and Bi(111) is accommodated by a periodic interfacial misfit dislocation array. On this relaxed template, Bi(111) films can be grown to any desired thickness. Such films are composed of twinned and 90 deg. rotated micrometer sized Bi(111) crystallites with a roughness of less than 0.6 nm for a 30 nm thick film.

  5. Microscopy of photoionisation processes

    SciTech Connect (OSTI)

    Aseyev, S A; Mironov, B N; Minogin, V G; Cherkun, Aleksandr P; Chekalin, Sergei V

    2013-04-30

    A method is demonstrated which combines the ionisation of free molecules by a sharply focused femtosecond laser beam and projection microscopy in a divergent electric field. The electric field is produced in vacuum between a metallic tip and a flat positionsensitive charged particle detector. The method enables investigation of photoionisation processes in low-density gases with a subdiffraction spatial resolution and can be used as well in profile measurements for sharply focused, intense laser beams. In a demonstration experiment, a femtosecond laser beam with a peak intensity of {approx}10{sup 14} W cm{sup -2} was focused to a 40-{mu}m-diameter waist in vacuum near a millimetre-size tip and {approx}2-{mu}m spatial resolution was achieved. According to our estimates, the use of a sharper tip will ensure a submicron spatial resolution, which is a crucial condition for the spatial diagnostics of sharply focused short-wavelength VUV radiation and X-rays. (extreme light fields and their applications)

  6. Ultrafast scanning probe microscopy

    DOE Patents [OSTI]

    Weiss, S.; Chemla, D.S.; Ogletree, D.F.; Botkin, D.

    1995-05-16

    An ultrafast scanning probe microscopy method is described for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample. 6 Figs.

  7. Ultrafast scanning probe microscopy

    DOE Patents [OSTI]

    Weiss, Shimon; Chemla, Daniel S.; Ogletree, D. Frank; Botkin, David

    1995-01-01

    An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.

  8. The Future of Electron Microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei

    2015-05-06

    Berkeley Lab scientist Haimei Zheng discusses the future of electron microscopy and her breakthrough research into examining liquids using an electron microscope.

  9. Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

    SciTech Connect (OSTI)

    Eliseev, E. A.; Morozovska, A. N.; Ievlev, Anton; Balke, Nina; Maksymovych, Petro; Tselev, Alexander; Kalinin, Sergei V

    2014-01-01

    Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

  10. [Band electronic structures and crystal packing forces

    SciTech Connect (OSTI)

    Not Available

    1993-01-01

    We investigated the electronic and structural properties of low-dimensional materials and explored the structure-property correlations governing their physical properties. Progress was made on how to interpret the scanning tunneling microscopy and atomic force microscopy images of layered materials and on how to account for charge density wave instabilities in 2-D metals. Materials studied included transition metal chalcogenides, transition metal halides, organic conducting salts, Mo bronzes, A[sub 2]PdH[sub 2], fullerenes, squarate tetrahydrate polymers Fe, Cu(C[sub 4]O[sub 4])4[center dot]H[sub 2]O, BEDT salts, etc.

  11. Interpretation of long-range interatomic force

    SciTech Connect (OSTI)

    Buldum, A.; Ciraci, S.; Fong, C.Y.; Nelson, J.S.

    1999-02-01

    Recent direct mechanical measurements of atomic force microscopy showed that the force between the silicon tip and the silicon sample is long range in the attractive region and its magnitude at maximum is relatively smaller. These features disagree with previous theoretical predictions based on the {ital ab initio} calculations. We investigated the nature of forces between a silicon tip and the silicon (111)-(2{times}1) surface by performing first-principles pseudopotential and classical molecular dynamics calculations and by calculating the van der Waals interaction. The first two methods give forces that are short range in nature. Fair agreement between the experiment and theory is obtained when the van der Waals interaction is included. The effect of the tip induced deformation is analyzed. {copyright} {ital 1999} {ital The American Physical Society}

  12. Open Source Scanning Probe Microscopy Control Software package GXSM

    SciTech Connect (OSTI)

    Zahl, P.; Wagner, T.; Moller, R.; Klust, A.

    2010-05-01

    GXSM is a full featured and modern scanning probe microscopy (SPM) software. It can be used for powerful multidimensional image/data processing, analysis, and visualization. Connected to an instrument, it is operating many different flavors of SPM, e.g., scanning tunneling microscopy and atomic force microscopy or, in general, two-dimensional multichannel data acquisition instruments. The GXSM core can handle different data types, e.g., integer and floating point numbers. An easily extendable plug-in architecture provides many image analysis and manipulation functions. A digital signal processor subsystem runs the feedback loop, generates the scanning signals, and acquires the data during SPM measurements. The programmable GXSM vector probe engine performs virtually any thinkable spectroscopy and manipulation task, such as scanning tunneling spectroscopy or tip formation. The GXSM software is released under the GNU general public license and can be obtained via the internet.

  13. Scanning Probe Microscopy with Spectroscopic Molecular Recognition - Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Innovation Portal Scanning Probe Microscopy with Spectroscopic Molecular Recognition Oak Ridge National Laboratory Contact ORNL About This Technology Technology Marketing SummaryORNL researchers developed an innovative imaging method that possesses the imaging capability of scanning near-field ultrasound holography and the chemical specificity of reverse photoacoustic spectroscopy. This imaging method can achieve chemical differentiation with nanometer resolution. DescriptionAtomic force

  14. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope

    SciTech Connect (OSTI)

    Sader, John E.; Lu, Jianing; Mulvaney, Paul

    2014-11-15

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  15. Visualizing Individual Carbon Nanotubes with Optical Microscopy...

    Office of Scientific and Technical Information (OSTI)

    Published Article: Visualizing Individual Carbon Nanotubes with Optical Microscopy Title: Visualizing Individual Carbon Nanotubes with Optical Microscopy Authors: Novak, Michael A. ...

  16. Electron Microscopy Catalysis Projects: Success Stories from...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Electron Microscopy Catalysis Projects: Success Stories from the High Temperature Materials Laboratory (HTML) User Program Electron Microscopy Catalysis Projects: Success Stories ...

  17. Reflected beam illumination microscopy using a microfluidics...

    Office of Scientific and Technical Information (OSTI)

    Reflected beam illumination microscopy using a microfluidics device - progress report 6152014. Citation Details In-Document Search Title: Reflected beam illumination microscopy ...

  18. The future of electron microscopy

    SciTech Connect (OSTI)

    Zhu, Yimei; Durr, Hermann

    2015-04-01

    Seeing is believing. So goes the old adage and seen evidence is undoubtedly satisfying because it can be interpreted easily, though not always correctly. For centuries, humans have developed such instruments as telescopes that observe the heavens and microscopes that reveal bacteria and viruses. The 2014 Nobel Prize in Chemistry was awarded to Eric Betzig, Stefan Hell, and William Moerner for their foundational work on superresolution fluorescence microscopy in which they overcame the Abbe diffraction limit for the resolving power of conventional light microscopes. (See Physics Today, December 2014, page 18.) That breakthrough enabled discoveries in biological research and testifies to the importance of modern microscopy.

  19. The future of electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhu, Yimei; Durr, Hermann

    2015-04-01

    Seeing is believing. So goes the old adage and seen evidence is undoubtedly satisfying because it can be interpreted easily, though not always correctly. For centuries, humans have developed such instruments as telescopes that observe the heavens and microscopes that reveal bacteria and viruses. The 2014 Nobel Prize in Chemistry was awarded to Eric Betzig, Stefan Hell, and William Moerner for their foundational work on superresolution fluorescence microscopy in which they overcame the Abbe diffraction limit for the resolving power of conventional light microscopes. (See Physics Today, December 2014, page 18.) That breakthrough enabled discoveries in biological research and testifiesmore » to the importance of modern microscopy.« less

  20. Multi-dimensional modelling of electrostatic force distance curve over dielectric surface: Influence of tip geometry and correlation with experiment

    SciTech Connect (OSTI)

    Boularas, A. Baudoin, F.; Villeneuve-Faure, C.; Clain, S.; Teyssedre, G.

    2014-08-28

    Electric Force-Distance Curves (EFDC) is one of the ways whereby electrical charges trapped at the surface of dielectric materials can be probed. To reach a quantitative analysis of stored charge quantities, measurements using an Atomic Force Microscope (AFM) must go with an appropriate simulation of electrostatic forces at play in the method. This is the objective of this work, where simulation results for the electrostatic force between an AFM sensor and the dielectric surface are presented for different bias voltages on the tip. The aim is to analyse force-distance curves modification induced by electrostatic charges. The sensor is composed by a cantilever supporting a pyramidal tip terminated by a spherical apex. The contribution to force from cantilever is neglected here. A model of force curve has been developed using the Finite Volume Method. The scheme is based on the Polynomial Reconstruction OperatorPRO-scheme. First results of the computation of electrostatic force for different tipsample distances (from 0 to 600?nm) and for different DC voltages applied to the tip (6 to 20?V) are shown and compared with experimental data in order to validate our approach.

  1. Protective Force Program Manual

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2000-06-30

    Provides detailed requirements to supplement DOE O 473.2, Protective Force Program, which establishes the requirements and responsibilities for management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Does not cancel other directives.

  2. Administering Work Force Discipline

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2015-05-14

    The order provides requirements and responsibilities for administering work force discipline and corrective actions. Supersedes DOE O 3750.1.

  3. Fluid force transducer

    DOE Patents [OSTI]

    Jendrzejczyk, Joseph A.

    1982-01-01

    An electrical fluid force transducer for measuring the magnitude and direction of fluid forces caused by lateral fluid flow, includes a movable sleeve which is deflectable in response to the movement of fluid, and a rod fixed to the sleeve to translate forces applied to the sleeve to strain gauges attached to the rod, the strain gauges being connected in a bridge circuit arrangement enabling generation of a signal output indicative of the magnitude and direction of the force applied to the sleeve.

  4. Free vibrations of U-shaped atomic force microscope probes

    SciTech Connect (OSTI)

    Rezaei, E.; Turner, J. A.

    2014-05-07

    Contact resonance atomic force microscope (AFM) methods have been used to quantify the elastic and viscoelastic properties of a variety of materials such as polymers, ceramics, biological materials, and metals with spatial resolution on the order of tens of nanometers. This approach involves measurement of the resonant frequencies of the AFM probe both for the free case and the case for which the tip is in contact with a sample. Vibration models of the probe and tip-sample contact models are then used to determine the sample properties from the frequency behavior and to create images of the sample properties. This work has been primarily focused on rectangular, single-beam probes for which the vibration models are relatively simple. Recently, U-shaped AFM probes have been developed to allow local heating of samples and the resonances of these probes are much more complex. In this article, a simplified analytical model of these U-shaped probes is described. This three beam model includes two beams clamped at one end and connected with a perpendicular cross beam at the other end. The beams are assumed only to bend in flexure and twist but their coupling allows a wide range of possible dynamic behavior. Results are presented for the first ten modes and the mode shapes are shown to have complex coupling between the flexure and twisting of the beams, particularly for the higher modes. All resonant frequency results are in good agreement with finite element results for the three probe designs and two values of thickness considered (all wavenumbers are within 3.0%). This work is anticipated to allow U-shaped probes to be used eventually for quantitative measurements of sample material properties during heating using a contact resonance approach.

  5. NREL: Measurements and Characterization - Analytical Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Analytical Microscopy Analytical microscopy uses various high-resolution techniques to obtain information about materials on the atomic scale. It is one of the most powerful tools available for understanding a material's basic structure, chemistry, and morphology. We use two complementary types of analytical microscopy - electron microscopy and scanning probe microscopy - together with a variety of state-of-the-art imaging and analytical tools to capture data about photovoltaic (PV) materials

  6. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    ... by atomic force microscopy (AFM), scanning electron microscopy (SEM), energy-dispersive spectroscopy, time-of-flight secondary ion mass spectrometry (ToF-SIMS), X-ray powder ...

  7. Coulomb force as an entropic force

    SciTech Connect (OSTI)

    Wang Tower

    2010-05-15

    Motivated by Verlinde's theory of entropic gravity, we give a tentative explanation to the Coulomb's law with an entropic force. When trying to do this, we find the equipartition rule should be extended to charges and the concept of temperature should be reinterpreted. If one accepts the holographic principle as well as our generalizations and reinterpretations, then Coulomb's law, the Poisson equation, and the Maxwell equations can be derived smoothly. Our attempt can be regarded as a new way to unify the electromagnetic force with gravity, from the entropic origin. Possibly some of our postulates are related to the D-brane picture of black hole thermodynamics.

  8. Dynamic imaging with electron microscopy

    ScienceCinema (OSTI)

    Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

    2014-05-30

    Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

  9. Hill Air Force Base

    Broader source: Energy.gov [DOE]

    Energy savings performance contracting at Hill Air Force Base generated much interest during a recent training session on energy management that downlinked 12 Department of Defense sites. Energy...

  10. Protective Force Program Manual

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2001-12-20

    Provides detailed requirements to supplement DOE O 473.2, PROTECTIVE FORCE PROGRAM, which establishes the requirements and responsibilities for management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Change 1 revised pages in Chapters IV and VI on 12/20/2001.

  11. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E.; Parvin, Bahram

    2009-06-09

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time: quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  12. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E.; Parvin, Bahram

    2011-05-24

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  13. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E; Parvin, Bahram

    2013-10-01

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  14. Atomic resolution scanning tunneling microscopy in a cryogen free dilution refrigerator at 15 mK

    SciTech Connect (OSTI)

    Haan, A. M. J. den Wijts, G. H. C. J.; Galli, F.; Oosterkamp, T. H.; Usenko, O.; Baarle, G. J. C. van; Zalm, D. J. van der

    2014-03-15

    Pulse tube refrigerators are becoming more common, because they are cost efficient and demand less handling than conventional (wet) refrigerators. However, a downside of a pulse tube system is the vibration level at the cold-head, which is in most designs several micrometers. We implemented vibration isolation techniques which significantly reduced vibration levels at the experiment. These optimizations were necessary for the vibration sensitive magnetic resonance force microscopy experiments at milli-kelvin temperatures for which the cryostat is intended. With these modifications we show atomic resolution scanning tunneling microscopy on graphite. This is promising for scanning probe microscopy applications at very low temperatures.

  15. Combining Quantitative Electrochemistry and Electron Microscopy...

    Office of Scientific and Technical Information (OSTI)

    Conference: Combining Quantitative Electrochemistry and Electron Microscopy to Study ... Resource Relation: Conference: Proposed for presentation at the Materials Research Society ...

  16. OOTW Force Design Tools

    SciTech Connect (OSTI)

    Bell, R.E.; Hartley, D.S.III; Packard, S.L.

    1999-05-01

    This report documents refined requirements for tools to aid the process of force design in Operations Other Than War (OOTWs). It recommends actions for the creation of one tool and work on other tools relating to mission planning. It also identifies the governmental agencies and commands with interests in each tool, from whom should come the user advisory groups overseeing the respective tool development activities. The understanding of OOTWs and their analytical support requirements has matured to the point where action can be taken in three areas: force design, collaborative analysis, and impact analysis. While the nature of the action and the length of time before complete results can be expected depends on the area, in each case the action should begin immediately. Force design for OOTWs is not a technically difficult process. Like force design for combat operations, it is a process of matching the capabilities of forces against the specified and implied tasks of the operation, considering the constraints of logistics, transport and force availabilities. However, there is a critical difference that restricts the usefulness of combat force design tools for OOTWs: the combat tools are built to infer non-combat capability requirements from combat capability requirements and cannot reverse the direction of the inference, as is required for OOTWs. Recently, OOTWs have played a larger role in force assessment, system effectiveness and tradeoff analysis, and concept and doctrine development and analysis. In the first Quadrennial Defense Review (QDR), each of the Services created its own OOTW force design tool. Unfortunately, the tools address different parts of the problem and do not coordinate the use of competing capabilities. These tools satisfied the immediate requirements of the QDR, but do not provide a long-term cost-effective solution.

  17. Reduction-in-Force

    Broader source: Energy.gov [DOE]

    Reduction in force (RIF) is a set of regulations and procedures that are used to determine whether an employee keeps his or her present position, or whether the employee has a right to another...

  18. Protective Force Program

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1995-02-13

    To prescribe Department of Energy policy, responsibilities, and requirements for the management and operation of the Protective Force Program. Chg 1 dated 2-13-95. Cancels DOE O 5632.7 and DOE O 5632.8.

  19. Three-body forces

    SciTech Connect (OSTI)

    Nefkens, B.M.K.

    1986-10-15

    A review of current knowledge of three-body forces from experimental and theoretical standpoints is given. The 3-H and 3-He nuclei are discussed. Also, nucleon scattering from deuterium is discussed. (AIP)

  20. Federal Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2009-07-15

    This Manual establishes requirements for the management and operation of the Department of Energy (DOE) Federal protective forces (FPFs). Cancels DOE M 470.4-3, Chg 1. Canceled by DOE O 473.3.

  1. Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

    SciTech Connect (OSTI)

    Torun, H.; Torello, D.; Degertekin, F. L.

    2011-08-15

    The authors describe a method of actuation for atomic force microscope (AFM) probes to improve imaging speed and displacement range simultaneously. Unlike conventional piezoelectric tube actuation, the proposed method involves a lever and fulcrum ''seesaw'' like actuation mechanism that uses a small, fast piezoelectric transducer. The lever arm of the seesaw mechanism increases the apparent displacement range by an adjustable gain factor, overcoming the standard tradeoff between imaging speed and displacement range. Experimental characterization of a cantilever holder implementing the method is provided together with comparative line scans obtained with contact mode imaging. An imaging bandwidth of 30 kHz in air with the current setup was demonstrated.

  2. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Record-Setting Microscopy Illuminates Energy Storage Materials Print Thursday, 22 January 2015 12:10 X-ray microscopy...

  3. Scanning probe microscopy competency development

    SciTech Connect (OSTI)

    Hawley, M.E.; Reagor, D.W.; Jia, Quan Xi

    1998-12-31

    This is the final report of a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The project collaborators developed an ultra-high vacuum scanning tunneling microscope (UHV-STM) capability, integrated it with existing scanning probe microscopes, and developed new, advanced air-based scanning force techniques (SPMs). Programmatic, basic, and industrially related laboratory research requires the existence of SPMs, as well as expertise capable of providing local nano-scale information. The UHV-STM capability, equipped with load-lock system and several surface science techniques, will allow introduction, examination, and reaction of surfaces prepared under well-controlled vacuum conditions, including the examination of morphology and local bonding associated with the initial stages of film growth under controlled growth conditions. The resulting capabilities will enable the authors to respond to a variety of problems requiring local characterization of conducting and nonconducting surfaces in liquids, air, and UHV.

  4. Electron Microscopy Center | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Electron Microscopy Center The Electron Microscopy Center Group (EMC) develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials challenges. EMC emphasizes three major areas: materials research, experimental technique and instrumentation development, and operation of unique and state-of-the-art instrumentation. The goals of EMC materials research are closely aligned with those of our user community.

  5. NREL: Measurements and Characterization - Scanning Electron Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Researcher using field-emission scanning electron microscope. Field emission scanning electron microscope (FE-SEM) JEOL 6320F. This FE-SEM equipped with a cold field-emission source and in-lens detectors is designed for ultra-high resolution at low accelerating voltage. Compositional mapping by energy-dispersive microscopy and Electron Backscattered Diffraction are available. In basic scanning electron microscopy (SEM), a beam of highly energetic (0.1-50 keV) electrons is

  6. NREL: Measurements and Characterization - Scanning Probe Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scanning Probe Microscopy Photo of NREL researcher using scanning probe microscope. Capability of use with ultra-high vacuum makes NREL Scanning Probe Microscopy particularly valuable for certain applications. Scanning probe microscopy (SPM) provides surface images at up to atomic scale and other valuable high-resolution data. SPM encompasses a group of techniques that use very sharp tips that scan extremely closely (several nm) to or in contact with the material being analyzed. The interaction

  7. Effect of homolog doping on surface morphology and mass-loss rates from PETN crystals. Studies using atomic force microscope and thermo-gravimetric analysis

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Bhattacharya, S. K.; Maiti, A; Gee, R. H.; Nunley, J.; Weeks, B. L.

    2012-08-28

    Pentaerythritol tetranitrate (PETN) is an important energetic material and its performance as a secondary explosive depends strongly on the density as well as flow porosity of powdered material, which in turn is governed by the size and surface properties of the PETN crystallite particles. Historically there has been evidence that the surface properties of PETN particles can be strongly influenced by the presence of homolog impurities of PETN, in particular, dipentaerythritol hexanitrate (diPEHN) and tripentaerythritol octanitrate (triPEON), although not many systematic studies characterizing such influence exist. In this work we employ thermogravimetric analysis (TGA) to measure mass-loss rates at elevatedmore » temperatures and show that doping with a small amount of diPEHN and triPEON can reduce the mass-loss rate from PETN single-crystal surfaces by as much as 35 % as compared to undoped crystals. Arrhenius plots of mass-loss rates as a function of temperature suggest that the reduction in evaporation is not due to the change in activation barrier of the molecular evaporation process, but perhaps due to the impedance to the receding motion of the steps by the immobile impurities on the surface. Removal of surface impurities through gentle washing with ethanol leads to enhanced mass-loss rate relative to pure PETN suggesting a roughened surface morphology. Some surface roughening in doped crystals is supported by Atomic force microscopy (AFM) images of growth layers that show evidences of growth layer stacking and rough edges. Furthermore, we find that a larger amount of impurity added to the original solution does not necessarily lead to a more highly doped crystal, which could perhaps be interpreted as PETN crystals being able to accommodate only up to a certain weight percent of homolog impurities.« less

  8. Work Force Restructuring Activities

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Work Force Restructuring Activities December 10, 2008 Note: Current updates are in bold # Planned Site/Contractor HQ Approved Separations Status General * LM has finalized the compilation of contractor management team separation data for the end of FY07 actuals and end of FY08 and FY09 projections. LM has submitted to Congress the FY 2007 Annual Report on contractor work force restructuring activities. The report has been posted to the LM website. *LM conducted a DOE complex-wide data call to

  9. Microscopy (XSD-MIC) | Advanced Photon Source

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microdiffraction, fluorescence tomography, coherent diffraction, and synchrotron x-ray scanning tunneling microscopy (SX-STM) This website is intended to provide useful...

  10. X-Ray Microscopy | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Microscopy X-Ray Microscopy This group exploits the unique capabilities of hard X-ray microscopy to visualize and understand the structure and behavior of hybrid, energy-related, and tailored nanomaterials The Hard X-Ray Nanoprobe, located at Sector 26 of the Advanced Photon Source (APS) and operated by our group and APS, is the only dedicated X-ray microscopy beamline within the portfolios of the nation's Nanoscale Science Research Centers. Our scientific program seeks to understand

  11. X-ray microscopy. Beyond ensemble averages

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ice, Gene E.; Budai, John D.

    2015-06-23

    This work exemplifies emerging tools to characterize local materials structure and dynamics, made possible by powerful X-ray synchrotron and transmission electron microscopy methods.

  12. Reflected beam illumination microscopy using a microfluidics...

    Office of Scientific and Technical Information (OSTI)

    using a microfluidics device - progress report 6152014. Citation Details In-Document Search Title: Reflected beam illumination microscopy using a microfluidics device - ...

  13. Scientific Achievement Analytical Transmission Electron Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Analytical Transmission Electron Microscopy (TEM) method was developed to determine thickness and wrinkles in electron beam sensitive 2-dimensional (2D) MFI nanosheets....

  14. Variable temperature electrochemical strain microscopy of Sm...

    Office of Scientific and Technical Information (OSTI)

    Sponsoring Org: SC USDOE - Office of Science (SC) Country of Publication: United States Language: English Subject: Solid-oxide fuel cells (SOFC); Electrochemical Strain Microscopy ...

  15. Radiation-thermoacoustic microscopy of condensed media

    SciTech Connect (OSTI)

    Lyamshev, L.M.; Chelnokov, B.I.

    1984-07-01

    Possibilities are discussed for the application of scanning radiation-thermoacoustic microscopy, using different types of radiation, for microstructure analysis. (AIP)

  16. Work Force Discipline

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1983-03-23

    The order provides guidance and procedures and states responsibilities for maintaining work force discipline in DOE. Chg 1, dated 3-11-85; Chg 2, dated 1-6-86; Chg 3, dated 3-21-89; Chg 4, dated 8-2-90; Chg 5, dated 3-9-92; Chg 6, dated 8-21-92, cancels Chg 5.

  17. Protective Force Program

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2000-06-30

    Establishes policy, requirements, responsibilities, and authorities, for the management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Extended until 7-7-06 by DOE N 251.64, dated 7-7-05 Cancels: DOE 5632.7A

  18. Direct Aerosol Forcing Uncertainty

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Mccomiskey, Allison

    2008-01-15

    Understanding sources of uncertainty in aerosol direct radiative forcing (DRF), the difference in a given radiative flux component with and without aerosol, is essential to quantifying changes in Earth's radiation budget. We examine the uncertainty in DRF due to measurement uncertainty in the quantities on which it depends: aerosol optical depth, single scattering albedo, asymmetry parameter, solar geometry, and surface albedo. Direct radiative forcing at the top of the atmosphere and at the surface as well as sensitivities, the changes in DRF in response to unit changes in individual aerosol or surface properties, are calculated at three locations representing distinct aerosol types and radiative environments. The uncertainty in DRF associated with a given property is computed as the product of the sensitivity and typical measurement uncertainty in the respective aerosol or surface property. Sensitivity and uncertainty values permit estimation of total uncertainty in calculated DRF and identification of properties that most limit accuracy in estimating forcing. Total uncertainties in modeled local diurnally averaged forcing range from 0.2 to 1.3 W m-2 (42 to 20%) depending on location (from tropical to polar sites), solar zenith angle, surface reflectance, aerosol type, and aerosol optical depth. The largest contributor to total uncertainty in DRF is usually single scattering albedo; however decreasing measurement uncertainties for any property would increase accuracy in DRF. Comparison of two radiative transfer models suggests the contribution of modeling error is small compared to the total uncertainty although comparable to uncertainty arising from some individual properties.

  19. Contractor Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2008-11-05

    This Manual establishes requirements for the management and operation of the U.S. Department of Energy contractor protective forces. Cancels: DOE M 470.4-3 Chg 1, CRD (Attachment 2) only, except for Section C. Canceled by DOE O 473.3.

  20. Microscopy & microanalysis 2016 in Columbus, Ohio

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Michael, Joseph R.

    2016-01-08

    The article provides information about an upcoming conference from the program chair. The Microscopy Society of America (MSA), the Microanalysis Society (MAS), and the International Metallographic Society (IMS) invite participation in Microscopy & Microanalysis 2016 in Columbus, Ohio, July 24 through July 28, 2016.

  1. Force Modulator System

    SciTech Connect (OSTI)

    Redmond Clark

    2009-04-30

    Many metal parts manufacturers use large metal presses to shape sheet metal into finished products like car body parts, jet wing and fuselage surfaces, etc. These metal presses take sheet metal and - with enormous force - reshape the metal into a fully formed part in a manner of seconds. Although highly efficient, the forces involved in forming metal parts also damage the press itself, limit the metals used in part production, slow press operations and, when not properly controlled, cause the manufacture of large volumes of defective metal parts. To date, the metal-forming industry has not been able to develop a metal-holding technology that allows full control of press forces during the part forming process. This is of particular importance in the automotive lightweighting efforts under way in the US automotive manufacturing marketplace. Metalforming Controls Technology Inc. (MC2) has developed a patented press control system called the Force Modulator that has the ability to control these press forces, allowing a breakthrough in stamping process control. The technology includes a series of hydraulic cylinders that provide controlled tonnage at all points in the forming process. At the same time, the unique cylinder design allows for the generation of very high levels of clamping forces (very high tonnages) in very small spaces; a requirement for forming medium and large panels out of HSS and AHSS. Successful production application of these systems testing at multiple stamping operations - including Ford and Chrysler - has validated the capabilities and economic benefits of the system. Although this technology has been adopted in a number of stamping operations, one of the primary barriers to faster adoption and application of this technology in HSS projects is system cost. The cost issue has surfaced because the systems currently in use are built for each individual die as a custom application, thus driving higher tooling costs. This project proposed to better

  2. TEXT Pro Force Training

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Basic Protective Force Training Program DOE/IG-0641 March 2004 * None of the 10 sites included instruction in rappelling even though it was part of the special response team core curriculum and continued to be offered by the Nonprolif- eration and National Security Institute; * Only one site conducted basic training on use of a shotgun, despite the fact that a num- ber of sites used the weapon for breaching exercises and other purposes; and, * Seven of the sites modified prescribed training

  3. ARMY SERVICE FORCES

    Office of Legacy Management (LM)

    ARMY SERVICE FORCES ' -, 1 MANHATTAN ENGINEER DISTRICT --t 4 IN "LPLI RC,' LR io EIDM CIS INTELLIGENCE AND SECURITY DIVISION CHICAGO BRANCH OFFICE i ., -,* - P. 0. Box 6770-A I ' 1 .' CHICAGO 80. ILLINOIS /lvb 15 February 1945 Subject: shipment Security Survey at &Uinckrodt Chemical Works. MEMORANDUM to the Officer in Charge. 1. The Mallinckrodt Chemical Works, St. Louis, Missouri, was contacted by the undersigned on 16 November 1944, for the purpose of -king an investigation to

  4. Growth analysis of cadmium sulfide thin films by atomic force microscopy

    SciTech Connect (OSTI)

    Moutinho, H.R.; Dhere, R.G.; Ramanathan, K.

    1996-05-01

    CdS films have been deposited by solution growth on SnO{sub 2} and glass substrates. Nucleation on SnO{sub 2} occurs at early deposition times, and complete conformal coverage is observed at low thickness values. The average grain size of the CdS films is established at these early times. In films deposited on glass substrates, nucleation is slower and occurs through 3-dimensional islands that increase in size and number as deposition proceeds. Optical measurements show that the bandgap values of CdS films deposited on SnO{sub 2} depend mainly on substrate structure. Hydrogen heat treatment does not affect the surface morphology of the samples, but decreases bandgap values.

  5. Mode-synthesizing atomic force microscopy and mode-synthesizing sensing

    DOE Patents [OSTI]

    Passain, Ali; Thundat, Thomas George; Tetard, Laurene

    2014-07-22

    A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.

  6. A 4 K cryogenic probe for use in magnetic resonance force microscopy experiments

    SciTech Connect (OSTI)

    Smith, Doran D.; Alexson, Dimitri A.; Garbini, Joseph L.

    2013-09-15

    The detailed design of a mechanically detected nuclear magnetic resonance probe using the SPAM (Springiness Preservation by Aligning Magnetization) geometry, operating at 4 K, in vacuum, and a several-Tesla magnetic field is described. The probe head is vibration-isolated well enough from the environment by a three-spring suspension system that the cantilever achieves thermal equilibrium with the environment without the aid of eddy current damping. The probe uses an ultra-soft Si cantilever with a Ni sphere attached to its tip, and magnetic resonance is registered as a change in the resonant frequency of the driven cantilever. The RF system uses frequency sweeps for adiabatic rapid passage using a 500 μm diameter RF coil wound around a sapphire rod. The RF coil and optical fiber of the interferometer used to sense the cantilever's position are both located with respect to the cantilever using a Garbini micropositioner, and the sample stage is mounted on an Attocube nanopositioner.

  7. Magnetic Force Microscopy Study of Zr2Co11 -Based Nanocrystalline Materials: Effect of Mo Addition

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Yue, Lanping; Jin, Yunlong; Zhang, Wenyong; Sellmyer, David J.

    2015-01-01

    Tmore » he addition of Molybdenum was used to modify the nanostructure and enhance coercivity of rare-earth-free Zr2Co11-based nanocrystalline permanent magnets. he effect of Mo addition on magnetic domain structures of melt spun nanocrystalline Zr16Co84-xMox(x=0, 0.5, 1, 1.5, and 2.0) ribbons has been investigated. It was found that magnetic properties and local domain structures are strongly influenced by Mo doping. he coercivity of the samples increases with the increase in Mo content (x≤1.5). he maximum energy product(BH)maxincreases with increasingxfrom 0.5 MGOe forx=0to a maximum value of 4.2 MGOe forx=1.5. he smallest domain size with a relatively short magnetic correlation length of 128 nm and largest root-mean-square phase shiftΦrmsvalue of 0.66° are observed for thex=1.5. he optimal Mo addition promotes magnetic domain structure refinement and thus leads to a significant increase in coercivity and energy product in this sample.« less

  8. Model based control of dynamic atomic force microscope

    SciTech Connect (OSTI)

    Lee, Chibum; Salapaka, Srinivasa M.

    2015-04-15

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H{sub ∞} control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  9. New Microscopy Patent Awarded | The Ames Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    New Microscopy Patent Awarded Congratulations to former Ames Laboratory staff Ning Fang and Wei Sun for being awarded a new patent, "Auto-calibrated scanning-angle prism-type total...

  10. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

    SciTech Connect (OSTI)

    Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; Lange, Dorus de; Sadeghian, Hamed E-mail: h.sadeghianmarnani@tudelft.nl

    2015-11-15

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

  11. Miniature quartz resonator force transducer

    DOE Patents [OSTI]

    EerNisse, E.P.

    The invention relates to a piezoelectric quartz force transducer having the shape of a double-ended tuning fork.

  12. Miniature quartz resonator force transducer

    DOE Patents [OSTI]

    Eer Nisse, Errol P.

    1980-01-01

    The invention relates to a piezoelectric quartz force transducer having the shape of a double-ended tuning fork.

  13. Force-Field Parameter Fitter

    Energy Science and Technology Software Center (OSTI)

    2015-05-27

    ParFit is a flexible and extendable framework and library of classes for fitting force-field parameters to data from high-level ab-initio calculations on the basis of deterministic and stochastic algorithms. Currently, the code is fitting MM3 and Merck force-field parameters but could easily extend to other force-field types.

  14. Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen; Kalinin, Sergei V; Nikiforov, Maxim P

    2013-07-09

    An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.

  15. Mapping the Nanoscale Landscape

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    composition maps (5 m x 5 m) of F8BT:TFB blend films (left and center). Comparative atomic-force microscopy (AFM) surface images (right) reveal micrometer-sized domains in...

  16. FY 2012 Annual Progress Report for Energy Storage R&D

    Broader source: Energy.gov (indexed) [DOE]

    ... range AEV All-electric vehicle AE-XRD Acoustic emission (AE) and X-ray diffraction AF Antiferromagnetic AFM Atomic force microscopy AGM Absorbed Glass Mat ALABC Advanced Lead Acid ...

  17. Normal Force and Drag Force in Magnetorheological Finishing

    SciTech Connect (OSTI)

    Miao, C.; Shafrir, S.N.; Lambropoulos, J.C.; Jacobs, S.D.

    2010-01-13

    The material removal in magnetorheological finishing (MRF) is known to be controlled by shear stress, tau, which equals drag force, Fd, divided by spot area, As. However, it is unclear how the normal force, Fn, affects the material removal in MRF and how the measured ratio of drag force to normal force Fd/Fn, equivalent to coefficient of friction, is related to material removal. This work studies, for the first time for MRF, the normal force and the measured ratio Fd/Fn as a function of material mechanical properties. Experimental data were obtained by taking spots on a variety of materials including optical glasses and hard ceramics with a spot-taking machine (STM). Drag force and normal force were measured with a dual load cell. Drag force decreases linearly with increasing material hardness. In contrast, normal force increases with hardness for glasses, saturating at high hardness values for ceramics. Volumetric removal rate decreases with normal force across all materials. The measured ratio Fd/Fn shows a strong negative linear correlation with material hardness. Hard materials exhibit a low coefficient of friction. The volumetric removal rate increases with the measured ratio Fd/Fn which is also correlated with shear stress, indicating that the measured ratio Fd/Fn is a useful measure of material removal in MRF.

  18. Three axis vector magnet set-up for cryogenic scanning probe microscopy

    SciTech Connect (OSTI)

    Galvis, J. A.; Herrera, E.; Buendía, A.; Guillamón, I.; Vieira, S.; Suderow, H.; Azpeitia, J.; Luccas, R. F.; Munuera, C.; García-Hernandez, M.; and others

    2015-01-15

    We describe a three axis vector magnet system for cryogenic scanning probe microscopy measurements. We discuss the magnet support system and the power supply, consisting of a compact three way 100 A current source. We obtain tilted magnetic fields in all directions with maximum value of 5T along z-axis and of 1.2T for XY-plane magnetic fields. We describe a scanning tunneling microscopy-spectroscopy (STM-STS) set-up, operating in a dilution refrigerator, which includes a new high voltage ultralow noise piezodrive electronics and discuss the noise level due to vibrations. STM images and STS maps show atomic resolution and the tilted vortex lattice at 150 mK in the superconductor β-Bi{sub 2}Pd. We observe a strongly elongated hexagonal lattice, which corresponds to the projection of the tilted hexagonal vortex lattice on the surface. We also discuss Magnetic Force Microscopy images in a variable temperature insert.

  19. Uncertainty in least-squares fits to the thermal noise spectra of nanomechanical resonators with applications to the atomic force microscope

    SciTech Connect (OSTI)

    Sader, John E.; Yousefi, Morteza; Friend, James R.; Melbourne Centre for Nanofabrication, Clayton, Victoria 3800

    2014-02-15

    Thermal noise spectra of nanomechanical resonators are used widely to characterize their physical properties. These spectra typically exhibit a Lorentzian response, with additional white noise due to extraneous processes. Least-squares fits of these measurements enable extraction of key parameters of the resonator, including its resonant frequency, quality factor, and stiffness. Here, we present general formulas for the uncertainties in these fit parameters due to sampling noise inherent in all thermal noise spectra. Good agreement with Monte Carlo simulation of synthetic data and measurements of an Atomic Force Microscope (AFM) cantilever is demonstrated. These formulas enable robust interpretation of thermal noise spectra measurements commonly performed in the AFM and adaptive control of fitting procedures with specified tolerances.

  20. Seeing through walls at the nanoscale: Microwave microscopy of...

    Office of Scientific and Technical Information (OSTI)

    Seeing through walls at the nanoscale: Microwave microscopy of enclosed objects and ... Title: Seeing through walls at the nanoscale: Microwave microscopy of enclosed objects and ...

  1. Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    High Resolution Electron Microscopy for Catalyst Characterization Ultra-High Resolution Electron Microscopy for Catalyst Characterization 2011 DOE Hydrogen and Fuel Cells Program, ...

  2. Ultra-high Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    high Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization 2009 DOE Hydrogen Program and Vehicle ...

  3. In-Situ Electron Microscopy of Electrical Energy Storage Materials...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    More Documents & Publications In-Situ Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials Investigations ...

  4. In-Situ Electron Microscopy of Electrical Energy Storage Materials...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    More Documents & Publications In-Situ Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials In-situ ...

  5. High-Resolution Photocurrent Microscopy Using Near-FieldCathodolumine...

    Office of Scientific and Technical Information (OSTI)

    High-Resolution Photocurrent Microscopy Using Near-Field Cathodoluminescence of Quantum Dots. Citation Details In-Document Search Title: High-Resolution Photocurrent Microscopy ...

  6. In Situ Transmission Electron Microscopy. (Conference) | SciTech...

    Office of Scientific and Technical Information (OSTI)

    In Situ Transmission Electron Microscopy. Citation Details In-Document Search Title: In Situ Transmission Electron Microscopy. Abstract not provided. Authors: Jungjohann, Katherine ...

  7. Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    pm029allard2010p.pdf More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst...

  8. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is ... removed the resolution limit imposed by the characteristics of the x-ray optics. ...

  9. Subangstrom Edge Relaxations Probed by Electron Microscopy in...

    Office of Scientific and Technical Information (OSTI)

    Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride Title: Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride ...

  10. Orientation imaging microscopy of polycrystalline sodium chloride

    SciTech Connect (OSTI)

    Staiger, M.P.; Kolbeinsson, I.; Newman, J.; Woodfield, T.; Sato, T.

    2010-04-15

    A novel preparation technique is described that makes possible grain size analysis of polycrystalline NaCl using orientation imaging microscopy via electron backscatter diffraction (EBSD). The preparation methodology is specifically developed to overcome difficulties in preparing microporous NaCl for microscopy. The grain size and crystallographic texture of polycrystalline NaCl samples, prepared via solution pressure and sintered in the range of 650-780 deg. C, were able to be measured successfully with EBSD. The limitations of the preparation technique for EBSD analysis of NaCl are also discussed.

  11. Electromechanical response of amorphous LaAlO{sub 3} thin film probed by scanning probe microscopies

    SciTech Connect (OSTI)

    Borowiak, Alexis S.; Baboux, Nicolas; Albertini, David; Gautier, Brice; Vilquin, Bertrand; Saint Girons, Guillaume; Pelloquin, Sylvain

    2014-07-07

    The electromechanical response of a 3 nm thick amorphous LaAlO{sub 3} layer obtained by molecular beam epitaxy has been studied using scanning probe microscopies. Although this kind of sample is not ferroelectric due to its amorphous nature, the resulting images are identical to what is generally obtained on truly ferroelectric samples probed by piezoresponse force microscopy: domains of apparently opposite polarisation are detected, and perfect, square shaped hysteresis loops are recorded. Moreover, written patterns are stable within 72 h. We discuss in the general case the possible origins of this behaviour in terms of charge injection, ionic conduction and motion of oxygen vacancies. In the case presented in this paper, since the writing process has been conducted with applied voltages lower than the injection threshold measured by conductive atomic force Microscopy, allowing to withdraw the hypothesis of charge injection in the sample, we propose that a bistable distribution of oxygen vacancies is responsible for this contrast.

  12. Portable dual field gradient force multichannel flow cytometer device with a dual wavelength low noise detection scheme

    DOE Patents [OSTI]

    James, Conrad D; Galambos, Paul C; Derzon, Mark S; Graf, Darin C; Pohl, Kenneth R; Bourdon, Chris J

    2012-10-23

    Systems and methods for combining dielectrophoresis, magnetic forces, and hydrodynamic forces to manipulate particles in channels formed on top of an electrode substrate are discussed. A magnet placed in contact under the electrode substrate while particles are flowing within the channel above the electrode substrate allows these three forces to be balanced when the system is in operation. An optical detection scheme using near-confocal microscopy for simultaneously detecting two wavelengths of light emitted from the flowing particles is also discussed.

  13. Air Force Renewable Energy Programs

    Office of Energy Efficiency and Renewable Energy (EERE)

    Presentation covers Air Force Renewable Energy Programs and is given at the Spring 2011 Federal Utility Partnership Working Group (FUPWG) meeting.

  14. Force As A Momentum Current

    SciTech Connect (OSTI)

    Munera, Hector A.

    2010-07-28

    Advantages of a neo-Cartesian approach to classical mechanics are noted. If conservation of linear momentum is the fundamental principle, Newton's three laws become theorems. A minor paradox in static Newtonian mechanics is identified, and solved by reinterpreting force as a current of momentum. Contact force plays the role of a mere midwife in the exchange of momentum; however, force cannot be eliminated from physics because it provides the numerical value for momentum current. In this sense, in a neo-Cartesian formulation of mechanics the concept of force becomes strengthened rather than weakened.

  15. Continuous Forcing Data, Darwin, Australia

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Jakob, Christian

    2010-09-22

    Long term, large scale continuous forcing data set for three complete wet seasons (2004-2005, 2005-2006 and 2006-2007) in Darwin, Australia.

  16. Continuous Forcing Data, Darwin, Australia

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Jakob, Christian

    Long term, large scale continuous forcing data set for three complete wet seasons (2004-2005, 2005-2006 and 2006-2007) in Darwin, Australia.

  17. Army Energy Initiatives Task Force

    Broader source: Energy.gov [DOE]

    Presentation—given at the Fall 2011 Federal Utility Partnership Working Group (FUPWG) meeting—covers the Army Energy Initiatives Task Force.

  18. Multi-terminal magnetotransport measurements over a tunable graphene p-n junction created by AFM-nanomachining

    SciTech Connect (OSTI)

    Schmidt, H.; Smirnov, D.; Rode, J.; Haug, R. J.

    2013-12-04

    An Atomic Force Microscope is used to alter one part of a single layer graphene sample locally. Transport experiments at low temperatures are then used to characterize the different parts independently with field effect and Hall measurements. It is shown, that the nanomachining leads to an effective doping in the altered area and therefore to a difference in the charge carrier density of ?n = 3.5 ? 10{sup 15}m{sup ?2} between the unchanged and changed part. These two parts can be tuned with a global backgate to form a junction of different polarity, i.e. a p-n junction.

  19. Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments

    SciTech Connect (OSTI)

    Oiko, V. T. A. Rodrigues, V.; Ugarte, D.; Martins, B. V. C.; Silva, P. C.

    2014-03-15

    Understanding the mechanical properties of nanoscale systems requires new experimental and theoretical tools. In particular, force sensors compatible with nanomechanical testing experiments and with sensitivity in the nN range are required. Here, we report the development and testing of a tuning-fork-based force sensor for in situ nanomanipulation experiments inside a scanning electron microscope. The sensor uses a very simple design for the electronics and it allows the direct and quantitative force measurement in the 1100 nN force range. The sensor response is initially calibrated against a nN range force standard, as, for example, a calibrated Atomic Force Microscopy cantilever; subsequently, applied force values can be directly derived using only the electric signals generated by the tuning fork. Using a homemade nanomanipulator, the quantitative force sensor has been used to analyze the mechanical deformation of multi-walled carbon nanotube bundles, where we analyzed forces in the 540 nN range, measured with an error bar of a few nN.

  20. Frontiers of in situ electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by inmore » this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.« less

  1. Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope

    SciTech Connect (OSTI)

    Kuwahara, Masashi; Abe, Hidekazu; Tokumoto, Hiroshi; Shima, Takayuki; Tominaga, Junji; Fukuda, Hajime

    2004-03-15

    A carbon nanotube (CNT) was successfully attached to a base probe with a blunt apex and subsequently used as a probe for an atomic force microscope (AFM). This setup demonstrates high spatial resolution properties, plus an advantage: we were able to readily identify the loss of the CNT from the end of the probe by the resultant sudden drop in resolution. This design of probe is expected to feature yet another advantage: that of relative immunity to accidental collision compared to a CNT attached to a commercially available sharp tip. We also discuss the problems specific to CNT-attached probes, which are carbon contamination of the sample surface and artifact images formed at the edge of pit structures. We demonstrate that carbon contamination can be suppressed by a rubbing procedure before the scanning use, and that pit artifacts can be eliminated by optimizing the CNT length.

  2. Sub-microsecond-resolution probe microscopy

    DOE Patents [OSTI]

    Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

    2014-04-01

    Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

  3. Steering the Self-Assembly of Octadecylamine Monolayers on Mica by Controlled Mechanical Energy Transfer from the AFM Tip

    SciTech Connect (OSTI)

    Benitez, J.J.; Heredia-Guerrero, J.A.; Salmeron, M.

    2010-06-24

    We have studied the effect of mechanical energy transfer from the tip of an Atomic Force Microscope on the dynamics of self-assembly of monolayer films of octadecylamine on mica. The formation of the self-assembled film proceeds in two successive stages, the first being a fast adsorption from solution that follows a Langmuir isotherm. The second is a slower process of island growth by aggregation of the molecules dispersed on the surface. We found that the dynamics of aggregation can be altered substantially by the addition of mechanical energy into the system through controlled tip-surface interactions. This leads to either the creation of pinholes in existing islands as a consequence of vacancy concentration, and to the assembly of residual molecules into more compact islands.

  4. Electron Microscopy Center Capabilities | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Capabilities ACAT: Argonne Chromatic Aberration-corrected TEM This FEI Titan 80-300 ST has a CEOS Cc/Cs corrector on the imaging side of the column to correct both spherical and chromatic aberrations. The Cc/Cs corrector also provides greatly-improved resolution and signal for energy filtered imaging and EELS. FEI Tecnai F20ST TEM/STEM This premier analytical transmission electron microscope (AEM) has specialized accessories including an energy-dispersive x-ray

  5. Fast electron microscopy via compressive sensing

    DOE Patents [OSTI]

    Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

    2014-12-09

    Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

  6. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray...

  7. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with...

  8. Scanning Photocurrent Microscopy of Si and Ge nanowires (Conference...

    Office of Scientific and Technical Information (OSTI)

    Country of Publication: United States Language: English Subject: 36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; CATALYSTS; DIFFUSION LENGTH; MICROSCOPY; PHOTOCURRENTS; ...

  9. Initial validation of FORCE2

    SciTech Connect (OSTI)

    Burge, S.W.

    1991-06-01

    Erosion has been identified as one of the significant design issues in fluid beds. A cooperative R&D venture of industry, research, and government organizations was recently formed to meet the industry need for a better understanding of erosion in fluid beds. Research focussed on bed hydrodynamics, which are considered to be the primary erosion mechanism. As part of this work, ANL developed an analytical model (FLUFIX) for bed hydrodynamics. Partial validation was performed using data from experiments sponsored by the research consortium. Development of a three-dimensional fluid bed hydrodynamic model was part of Asea-Babcock`s in-kind contribution to the R&D venture. This model, FORCE2, was developed by Babcock & Wilcox`s Research and Development Division existing B&W program and on the gas-solids modeling and was based on an existing B&W program and on the gas-solids modeling technology developed by ANL and others. FORCE2 contains many of the features needed to model plant size beds and, therefore can be used along with the erosion technology to assess metal wastage in industrial equipment. As part of the development efforts, FORCE2 was partially validated using ANL`s two-dimensional model, FLUFIX, and experimental data. Time constraints as well as the lack of good hydrodynamic data, particularly at the plant scale, prohibited a complete validation of FORCE2. This report describes this initial validation of FORCE2.

  10. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2003-01-01

    An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

  11. Studying The Kinetics Of Crystalline Silicon Nanoparticle Lithiation With In-Situ Transmission Electron Microscopy

    SciTech Connect (OSTI)

    Mcdowell, Matthew T.; Ryu, Ill; Lee, Seokwoo; Wang, Chong M.; Nix, William D.; Cui, Yi

    2012-11-27

    Silicon is an attractive high-capacity anode material for Li-ion batteries, but a comprehensive understanding of the massive ~300% volume change and fracture during lithiation/delithiation is necessary to reliably employ Si anodes. Here, in-situ transmission electron microscopy (TEM) of the lithiation of crystalline Si nanoparticles reveals that the reaction slows down as it progresses into the particle interior. Analysis suggests that this behavior is due to the influence of mechanical stress at the reaction front on the driving force for the reaction. These experiments give insight into the factors controlling the kinetics of this unique reaction.

  12. DOE Contractor Work Force Restructuring Approval Thresholds

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Contractor Work Force Restructuring Approval Thresholds Up to 100 employees Contractor can ... to provide approval for NNSA work force restructurings in consultation with LM 501 ...

  13. Automatic HTS force measurement instrument

    DOE Patents [OSTI]

    Sanders, Scott T.; Niemann, Ralph C.

    1999-01-01

    A device for measuring the levitation force of a high temperature superconductor sample with respect to a reference magnet includes a receptacle for holding several high temperature superconductor samples each cooled to superconducting temperature. A rotatable carousel successively locates a selected one of the high temperature superconductor samples in registry with the reference magnet. Mechanism varies the distance between one of the high temperature superconductor samples and the reference magnet, and a sensor measures levitation force of the sample as a function of the distance between the reference magnet and the sample. A method is also disclosed.

  14. Automatic HTS force measurement instrument

    DOE Patents [OSTI]

    Sanders, S.T.; Niemann, R.C.

    1999-03-30

    A device is disclosed for measuring the levitation force of a high temperature superconductor sample with respect to a reference magnet includes a receptacle for holding several high temperature superconductor samples each cooled to superconducting temperature. A rotatable carousel successively locates a selected one of the high temperature superconductor samples in registry with the reference magnet. Mechanism varies the distance between one of the high temperature superconductor samples and the reference magnet, and a sensor measures levitation force of the sample as a function of the distance between the reference magnet and the sample. A method is also disclosed. 3 figs.

  15. Thermal expansion recovery microscopy: Practical design considerations

    SciTech Connect (OSTI)

    Mingolo, N. Martnez, O. E.

    2014-01-15

    A detailed study of relevant parameters for the design and operation of a photothermal microscope technique recently introduced is presented. The technique, named thermal expansion recovery microscopy (ThERM) relies in the measurement of the defocusing introduced by a surface that expands and recovers upon the heating from a modulated source. A new two lens design is presented that can be easily adapted to commercial infinite conjugate microscopes and the sensitivity to misalignment is analyzed. The way to determine the beam size by means of a focus scan and the use of that same scan to verify if a thermoreflectance signal is overlapping with the desired ThERM mechanism are discussed. Finally, a method to cancel the thermoreflectance signal by an adequate choice of a nanometric coating is presented.

  16. Casimir force in absorbing multilayers

    SciTech Connect (OSTI)

    Tomas, M.S.

    2002-11-01

    The Casimir effect in a dispersive and absorbing multilayered system is considered adopting the (net) vacuum-field pressure point of view to the Casimir force. Using the properties of the macroscopic field operators appropriate for absorbing systems and a convenient compact form of the Green function for a multilayer, a straightforward and transparent derivation of the Casimir force in a lossless layer of an otherwise absorbing multilayer is presented. The resulting expression, in terms of the reflection coefficients of the surrounding stacks of layers, is of the same form as that obtained by Zhou and Spruch for a purely dispersive multilayer using the (surface) mode summation method [Phys. Rev. A 52, 297 (1995)]. Owing to the recursion relations that the generalized Fresnel coefficients satisfy, this result can be applied to more complex systems with planar symmetry. This is illustrated by calculating the Casimir force on a dielectric (metallic) slab in a planar cavity with realistic mirrors. Also, a relationship between the Casimir force and energy in two different layers is established.

  17. Fuel oil quality task force

    SciTech Connect (OSTI)

    Laisy, J.; Turk, V.

    1997-09-01

    In April, 1996, the R.W. Beckett Corporation became aware of a series of apparently unrelated symptoms that made the leadership of the company concerned that there could be a fuel oil quality problem. A task force of company employees and industry consultants was convened to address the topic of current No. 2 heating oil quality and its effect on burner performance. The task force studied changes in fuel oil specifications and trends in properties that have occurred over the past few years. Experiments were performed at Beckett and Brookhaven National Laboratory to understand the effect of changes in some fuel oil properties. Studies by other groups were reviewed, and field installations were inspected to gain information about the performance of fuel oil that is currently being used in the U.S. and Canada. There was a special concern about the use of red dye in heating oils and the impact of sulfur levels due to the October, 1993 requirement of low sulfur (<0.05%) for on-highway diesel fuel. The results of the task force`s efforts were published in July, 1996. The primary conclusion of the task force was that there is not a crisis or widespread general problem with fuel oil quality. Localized problems that were seen may have been related to refinery practices and/or non-traditional fuel sources. System cleanliness is very important and the cause of many oil burner system problems. Finally, heating oil quality should get ongoing careful attention by Beckett engineering personnel and heating oil industry groups.

  18. [Band electronic structures and crystal packing forces]. Progress report, [March 1992--February 1993

    SciTech Connect (OSTI)

    Not Available

    1993-03-01

    We investigated the electronic and structural properties of low-dimensional materials and explored the structure-property correlations governing their physical properties. Progress was made on how to interpret the scanning tunneling microscopy and atomic force microscopy images of layered materials and on how to account for charge density wave instabilities in 2-D metals. Materials studied included transition metal chalcogenides, transition metal halides, organic conducting salts, Mo bronzes, A{sub 2}PdH{sub 2}, fullerenes, squarate tetrahydrate polymers Fe, Cu(C{sub 4}O{sub 4})4{center_dot}H{sub 2}O, BEDT salts, etc.

  19. Solvent-induced forces in protein folding

    SciTech Connect (OSTI)

    Ben-Naim, A. (Hebrew Univ., Jerusalem (Israel))

    1990-08-23

    The solvent-induced forces between various groups on the protein are examined. It is found that the intramolecular hydrophilic forces are likely to be the strongest forces mediated through the solvent. It is argued that these are probably the most important solvent-induced driving forces in the process of protein folding.

  20. October 9, 2014- SEAB Task Force Meeting

    Broader source: Energy.gov [DOE]

    SECRETARY OF ENERGY ADVISORY BOARDTask Force Meeting on Technology Development for Environmental Management (EM)

  1. Scanning magnetoresistance microscopy of atom chips

    SciTech Connect (OSTI)

    Volk, M.; Whitlock, S.; Wolff, C. H.; Hall, B. V.; Sidorov, A. I.

    2008-02-15

    Surface based geometries of microfabricated wires or patterned magnetic films can be used to magnetically trap and manipulate ultracold neutral atoms or Bose-Einstein condensates. We investigate the magnetic properties of such atom chips using a scanning magnetoresistive (MR) microscope with high spatial resolution and high field sensitivity. By comparing MR scans of a permanent magnetic atom chip to field profiles obtained using ultracold atoms, we show that MR sensors are ideally suited to observe small variations of the magnetic field caused by imperfections in the wires or magnetic materials which ultimately lead to fragmentation of ultracold atom clouds. Measurements are also provided for the magnetic field produced by a thin current-carrying wire with small geometric modulations along the edge. Comparisons of our measurements with a full numeric calculation of the current flow in the wire and the subsequent magnetic field show excellent agreement. Our results highlight the use of scanning MR microscopy as a convenient and powerful technique for precisely characterizing the magnetic fields produced near the surface of atom chips.

  2. Complete information acquisition in scanning probe microscopy

    SciTech Connect (OSTI)

    Belianinov, Alex; Kalinin, Sergei V; Jesse, Stephen

    2015-01-01

    In the last three decades, scanning probe microscopy (SPM) has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of the SPM measurements is the information transfer from the tip-surface junction to a macroscopic measurement system. This process reduces the many degrees of freedom of a vibrating cantilever to relatively few parameters recorded as images. Similarly, the details of dynamic cantilever response at sub-microsecond time scales of transients, higher-order eigenmodes and harmonics are averaged out by transitioning to millisecond time scale of pixel acquisition. Hence, the amount of information available to the external observer is severely limited, and its selection is biased by the chosen data processing method. Here, we report a fundamentally new approach for SPM imaging based on information theory-type analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material s properties and their mutual interactions, and SPM imaging at the information channel capacity limit.

  3. Complete information acquisition in scanning probe microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Belianinov, Alex; Kalinin, Sergei V.; Jesse, Stephen

    2015-03-13

    In the last three decades, scanning probe microscopy (SPM) has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of the SPM measurements is the information transfer from the tip-surface junction to a macroscopic measurement system. This process reduces the many degrees of freedom of a vibrating cantilever to relatively few parameters recorded as images. Similarly, the details of dynamic cantilever response at sub-microsecond time scales of transients, higher-order eigenmodes and harmonics are averaged out by transitioning to millisecond time scale of pixel acquisition. Hence, the amount of information available to the external observer ismore » severely limited, and its selection is biased by the chosen data processing method. Here, we report a fundamentally new approach for SPM imaging based on information theory-type analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material s properties and their mutual interactions, and SPM imaging at the information channel capacity limit.« less

  4. X-ray optics for scanning fluorescence microscopy and other applications

    SciTech Connect (OSTI)

    Ryon, R.W.; Warburton, W.K.

    1992-05-01

    Scanning x-ray fluorescence microscopy is analogous to scanning electron microscopy. Maps of chemical element distribution are produced by scanning with a very small x-ray beam. Goal is to perform such scanning microscopy with resolution in the range of <1 to 10 {mu}m, using standard laboratory x-ray tubes. We are investigating mirror optics in the Kirkpatrick-Baez (K-B) configuration. K-B optics uses two curved mirrors mounted orthogonally along the optical axis. The first mirror provides vertical focus, the second mirror provides horizontal focus. We have used two types of mirrors: synthetic multilayers and crystals. Multilayer mirrors are used with lower energy radiation such as Cu K{alpha}. At higher energies such as Ag K{alpha}, silicon wafers are used in order to increase the incidence angles and thereby the photon collection efficiency. In order to increase the surface area of multilayers which reflects x-rays at the Bragg angle, we have designed mirrors with the spacing between layers graded along the optic axis in order to compensate for the changing angle of incidence. Likewise, to achieve a large reflecting surface with silicon, the wafers are placed on a specially designed lever arm which is bent into a log spiral by applying force at one end. In this way, the same diffracting angle is maintained over the entire surface of the wafer, providing a large solid angle for photon collection.

  5. Electron Microscopy > Analytical Resources > Research > The Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Materials Center at Cornell Analytical Resources In This Section Differential Electrochemical Mass Spectroscopy (DEMS) Electron Microscopy X-Ray Diffraction Electron Microscopy Aberration-Corrected Electron Microscope Facility Electron microscopy provides atomic-resolution images of the structure, composition and bonding of our fuel cells and their components. Three-dimensional images of catalyst particles and their support materials are constructed using electron tomography - a similar

  6. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Record-Setting Microscopy Illuminates Energy Storage Materials Print Thursday, 22 January 2015 12:10 X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics.

  7. Stimulation Emission Depletion (STED) microscopy | The Ames Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Stimulation Emission Depletion (STED) microscopy What is STED? Stimulation Emission Depletion (STED) microscopy is a super resolution microscopy tool that captures super resolution images on a nanometer scale. A donut-shaped red light switches off surrounding molecules, allowing only those in the center to fluoresce. At the nanoscale, light microscopes cannot tell features apart. Because light moves as waves and the particles of light are so close together, the lens used cannot focus all of the

  8. Optoacoustic Microscopy for Investigation of MaterialNanostructures...

    Office of Scientific and Technical Information (OSTI)

    be used for quantitative imaging of nanoscale material features - including features that may be buried so as to be inaccessible to conventional lightwave or electron microscopies. ...

  9. A Sealed Liquid Cell for In Situ Transmission Electron Microscopy...

    Office of Scientific and Technical Information (OSTI)

    A Sealed Liquid Cell for In Situ Transmission Electron Microscopy of Controlled Electrochemical Processes Citation Details In-Document Search Title: A Sealed Liquid Cell for In ...

  10. Simultaneous cryo X-ray ptychographic and fluorescence microscopy...

    Office of Scientific and Technical Information (OSTI)

    ptychographic and fluorescence microscopy of green algae You are accessing a document from the Department of Energy's (DOE) Public Access Gateway for Energy & Science (PAGES). ...

  11. Modulated microwave microscopy and probes used therewith (Patent...

    Office of Scientific and Technical Information (OSTI)

    Citation Details In-Document Search Title: Modulated microwave microscopy and probes used therewith A microwave microscope including a probe tip electrode vertically positionable ...

  12. Simultaneous cryo X-ray ptychographic and fluorescence microscopy...

    Office of Scientific and Technical Information (OSTI)

    Accepted Manuscript: Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae Prev Next Title: Simultaneous cryo X-ray ptychographic and fluorescence ...

  13. X-Ray Microscopy Reveals How Crystal Mechanics Drive Battery...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Microscopy Reveals How Crystal Mechanics Drive Battery Performance Print ... are one of the best performing battery electrode materials, able to repeatedly ...

  14. Simultaneous cryo X-ray ptychographic and fluorescence microscopy...

    Office of Scientific and Technical Information (OSTI)

    and fluorescence microscopy of green algae Citation Details In-Document Search ... Visit OSTI to utilize additional information resources in energy science and technology. A ...

  15. NEAR-IR TWO PHOTON MICROSCOPY IMAGING OF SILICA NANOPARTICLES...

    Office of Scientific and Technical Information (OSTI)

    NANOPARTICLES FUNCTIONALIZED WITH ISOLATED SENSITIZED Yb(III) CENTERS Citation Details In-Document Search Title: NEAR-IR TWO PHOTON MICROSCOPY IMAGING OF SILICA NANOPARTICLES ...

  16. In situ transmission electron microscopy investigation of the...

    Office of Scientific and Technical Information (OSTI)

    In situ transmission electron microscopy investigation of the interfacial reaction between Ni and Al during rapid heating in a nanocalorimeter Grapes, Michael D. Department of...

  17. In situ transmission electron microscopy investigation of the...

    Office of Scientific and Technical Information (OSTI)

    Published Article: In situ transmission electron microscopy investigation of the interfacial reaction between Ni and Al during rapid heating in a nanocalorimeter Title: In situ...

  18. "A Novel Objective for EUV Microscopy and EUV Lithography" Inventors...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Novel Objective for EUV Microscopy and EUV Lithography" Inventors ..--.. Manfred Bitter, Kenneth Hill, Philip Efthimion. This invention is a new x-ray scheme for stigmatic...

  19. X-Ray Diffraction Microscopy of Magnetic Structures (Journal...

    Office of Scientific and Technical Information (OSTI)

    Prev Next Title: X-Ray Diffraction Microscopy of Magnetic Structures Authors: Turner, Joshua J. ; Huang, Xiaojing ; Krupin, Oleg ; Seu, Keoki A. ; Parks, Daniel ; Kevan,...

  20. Hickam Air Force Base | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Technology Validation » Hickam Air Force Base Hickam Air Force Base Photo of hybrid fuel cell bus at Hickam Air Force Base Hickam Air Force Base spans 2,850 acres in Honolulu, Hawaii. The military base is home to the 15th Airlift Wing, the Hawaii Air National Guard, and the Pacific Air Forces headquarters. With support from the Hawaii Center for Advanced Transportation Technologies and the Air Force Advanced Power Technology Office, Hickam added a fuel cell hybrid electric bus to its fleet in

  1. SAVANNAH RIVER SITE FORCE REPORT

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    FORCE REPORT 3rd Quarter - FY 2016 Data Date:June 30, 2016 Feds/ Prime Contract 1st Tier Teaming Subs Staff Aug / Support Service Craft / Union Hall / Trades Part Time / Limited Service Site TOTAL Federal Organizations DOE-SR 269 7 62 - - 338 DOE-OIG-SR 15 1 - - - 16 NNSA-SRFO 24 1 - 25 NNSA APM 20 2 12 - - 34 NNSA NA-23 10 - 3 - - 13 EM Only Total 269 8 62 - - 339 NNSA Only Total 54 2 16 - - 72 Other Funding Total 15 - - - - 15 Federal Total 338 10 78 - - 426 SRS Contracts SRNS 4,644 - 359 317

  2. ARMY SERiWE FORCES

    Office of Legacy Management (LM)

    ' This doc~omnt consists tif-..$---..-- PaWs ?5-i3s4 " No.,J ______ d&---.copies. series.-f;;i, ' ARMY SERiWE FORCES UNITED STATES ' ENGINEER OFFICE MANHP.~AN Dwmtcr CHIWOO A\RU o,,,c* P. 0. 90x 3140 A CHICA so, ILrlNole 20 June 1945 F' '2 0 Subject: Licenae Agreement - International Pulverizing Corporation - Subcoritract #7401-37-82. To: The District~Eqinssr, U. S. Engineer Office, Manhattan District, Oak Ridge, Tennessee. Attention: Contract Section. As llsted'below, there are

  3. Link Force Holdings Ltd | Open Energy Information

    Open Energy Info (EERE)

    search Name: Link Force Holdings Ltd Place: China Product: China-based energy saving LED street light maker. References: Link Force Holdings Ltd1 This article is a stub. You...

  4. US Wind Force LLC | Open Energy Information

    Open Energy Info (EERE)

    Jump to: navigation, search Name: US Wind Force LLC Place: Wexford, Pennsylvania Zip: PA 15090-9 Sector: Wind energy Product: US Wind Force, LLC is an independent, privately...

  5. ESPC Success Story - Dyess Air Force Base

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    DYESS AIR FORCE BASE DYESS, TEXAS Water Conservation and Green Energy ESPC SUCCESS STORY Dyess Air Force Base and surrounding west Texas has been under extreme-drought water ...

  6. U.S. Air Force (USAF) Air Force Research Laboratory (AFRL)

    Broader source: Energy.gov (indexed) [DOE]

    Benjamin Leever U.S. Air Force (USAF) Air Force Research Laboratory (AFRL) DOE - DoD ... level - Fourth level Fifth level - - - DOD Application Commercial Counterparts Sensor ...

  7. September 2012, Work Force Retention Work Group Status Overview

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Work Force Retention Work Group Status Overview 2 Subgroups: Pro-Force and Non-Pro-Force Pro-Force Subgroup: Accomplishments: 1. Completion of 10 CFR 1046 Protective Force ...

  8. Micromechanism linear actuator with capillary force sealing

    DOE Patents [OSTI]

    Sniegowski, Jeffry J.

    1997-01-01

    A class of micromachine linear actuators whose function is based on gas driven pistons in which capillary forces are used to seal the gas behind the piston. The capillary forces also increase the amount of force transmitted from the gas pressure to the piston. In a major subclass of such devices, the gas bubble is produced by thermal vaporization of a working fluid. Because of their dependence on capillary forces for sealing, such devices are only practical on the sub-mm size scale, but in that regime they produce very large force times distance (total work) values.

  9. Dark Forces At The Tevatron

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Buckley, Matt; Fileviez Perez, Pavel; Hooper, Dan; Neil, Ethan

    2011-08-19

    A simple explanation of the W + dijet excess recently reported by the CDF collaboration involves the introduction of a new gauge boson with sizable couplings to quarks, but with no or highly suppressed couplings to leptons. Anomaly-free theories which include such a leptophobic gauge boson must also include additional particle content, which may include a stable and otherwise viable candidate for dark matter. Based on the couplings and mass of the Z` required to generate the CDF excess, we predict such a dark matter candidate to possess an elastic scattering cross section with nucleons on the order of σmore » ~ 10-40 cm2, providing a natural explanation for the signals reported by the CoGeNT and DAMA/LIBRA collaborations. In this light, CDF may be observing the gauge boson responsible for the force which mediates the interactions between the dark and visible matter of our universe.« less

  10. Patterned arrays of capped platinum nanowires with quasi-elastic mechanical response to lateral force

    SciTech Connect (OSTI)

    Hottes, M. Muench, F.; Rauber, M.; Stegmann, C.; Ensinger, W.; Dassinger, F.; Schlaak, H. F.

    2015-02-02

    In this Letter, we describe the electrodeposition of capped, micro-sized Pt nanowire arrays in ion-track etched polymer templates and measure their collective mechanical response to an external force. By using an aperture mask during the irradiation process, it was possible to restrict the creation of pores in the templates to defined areas, allowing the fabrication of small nanowire arrays in different geometries and sizes. The simultaneous and highly reliable formation of many nanowire arrays was achieved using a pulsed electrodeposition technique. After deposition, the polymer matrix was removed using a gentle, dry oxygen plasma treatment, resulting in an excellent preservation of the array nanostructure as confirmed by scanning electron microscopy. A force measuring station was set up to perform mechanical characterization series on free-standing arrays. The nanowire arrays show a high robustness and respond sensitively to the applied force, making them attractive as spring elements in miniaturized inertial sensors, for example.

  11. Study of Martensitic Phase transformation in a NiTiCu Thin Film Shape Memory Alloy Using Photoelectron Emission Microscopy

    SciTech Connect (OSTI)

    Cai, Mingdong; Langford, Stephen C.; Wu, Maggie J.; Huang, W. M.; Xiong, Gang; Droubay, Timothy C.; Joly, Alan G.; Beck, Kenneth; Hess, Wayne P.; Dickinson, J. T.

    2007-01-01

    The thermally-induced martensitic phase transformation in a polycrystalline NiTiCu thin film shape memory alloy was probed by photoelectron emission microscopy (PEEM). In situ PEEM images reveal distinct changes in microstructure and photoemission intensity at the phase transition temperatures. In particular, images of the low temperature, martensite phase are brighter than that of the high temperature, austenite phase, due to the relatively lower work function of the martensite. Ultra-violet photoelectron spectroscopy shows that the effective work function changes by about 0.16 eV during thermal cycling. In situ PEEM images also show that the network of trenches observed on the room temperature film disappear suddenly during heating and reappear suddenly during subsequent cooling. These trenches are also characterized by atomic force microscopy at selected temperatures. We describe implications of these observations with respect to the spatial distribution of phases during thermal cycling in this thin film shape memory alloy.

  12. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in...

  13. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing...

  14. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lensless Imaging of Magnetic Nanostructures Work performed on ALS Beamline 12.0.2.2 Citation: J.J. Turner et al., "X-Ray Diffraction Microscopy of Magnetic Structures," Phys....

  15. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with...

  16. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in ...

  17. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing ...

  18. THz near-field microscopy of graphene structures. (Conference...

    Office of Scientific and Technical Information (OSTI)

    Title: THz near-field microscopy of graphene structures. Abstract not provided. Authors: Pan, Wei ; Brener, Igal ; Mitrofanov, O ; Thompson, R ; Yu, W ; berger, c ; de heer, w.a. ; ...

  19. Authorize_Changes_Contractor_Work_Force_Restructuring_Policy...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    AuthorizeChangesContractorWorkForceRestructuringPolicy.pdf AuthorizeChangesContractorWorkForceRestructuringPolicy.pdf PDF icon AuthorizeChangesContractorWorkForceR...

  20. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  1. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  2. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  3. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  4. Localized surface plasmon assisted contrast microscopy for ultrathin transparent specimens

    SciTech Connect (OSTI)

    Wei, Feifei; Lu, Dylan; Aguinaldo, Ryan; Ma, Yicong; Sinha, Sunil K.; Liu, Zhaowei

    2014-10-20

    We demonstrate a high contrast imaging technique, termed localized surface plasmon assisted contrast microscopy, by combining localized surface plasmon resonances (LSPR) and dark-field microscopy technique. Due to the sensitive response of LSPR to the refractive index of the surrounding media, this technique is capable of converting a small refractive index difference to a change in scattering intensity, resulting in a high-contrast, diffraction limited image of a thin unstained specimen with small, gradual refractive-index variation.

  5. In-Situ Electron Microscopy of Electrical Energy Storage Materials |

    Broader source: Energy.gov (indexed) [DOE]

    Department of Energy 1 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies Program Annual Merit Review and Peer Evaluation es095_unocic_2011_o.pdf (1.17 MB) More Documents & Publications In-Situ Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials In-situ characterization and diagnostics of mechanical degradation in electrodes

  6. Scanning Transmission Electron Microscopy Investigations of Complex Oxides

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    | Stanford Synchrotron Radiation Lightsource Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of Chemistry, University of South Carolina High-Angle-Annular-Dark-Field/Scanning Transmission Electron Microscopy (HAADF/STEM) is a technique uniquely suited for detailed studies of the structure and composition of complex oxides. The HAADF detector collects electrons

  7. Ultra-High Resolution Electron Microscopy for Catalyst Characterization |

    Broader source: Energy.gov (indexed) [DOE]

    Department of Energy lm034_rohatgi_2011_o.pdf (1.05 MB) More Documents & Publications Vehicle Technologies Office: 2010 Lightweight Materials R&D Annual Progress Report Nanostructured Materials by Machining 2011 Annual Progress Report for Lightweighting Materials Department of Energy

    pm029_allard_2011_p.pdf (2.39 MB) More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst

  8. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  9. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  10. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  11. Casimir force between integrable and chaotic pistons

    SciTech Connect (OSTI)

    Alvarez, Ezequiel; Mazzitelli, Francisco D.; Wisniacki, Diego A. [Departamento de Fisica, Facultad de Ciencias Exactas y Naturales Universidad de Buenos Aires, and Instituto de Fisica de Buenos Aires, Concejo Nacional de Investigaciones Cientificas y Tecnicas, Ciudad Universitaria, Pabellon I, 1428 Buenos Aires (Argentina); Monastra, Alejandro G. [Gerencia de Investigacion y Aplicaciones, Comision Nacional de Energia Atomica, Concejo Nacional de Investigaciones Cientificas y Tecnicas, Avenida General Paz 1499, 1650 San Martin (Argentina)

    2010-11-15

    We have computed numerically the Casimir force between two identical pistons inside a very long cylinder, considering different shapes for the pistons. The pistons can be considered quantum billiards, whose spectrum determines the vacuum force. The smooth part of the spectrum fixes the force at short distances and depends only on geometric quantities like the area or perimeter of the piston. However, correcting terms to the force, coming from the oscillating part of the spectrum which is related to the classical dynamics of the billiard, could be qualitatively different for classically integrable or chaotic systems. We have performed a detailed numerical analysis of the corresponding Casimir force for pistons with regular and chaotic classical dynamics. For a family of stadium billiards, we have found that the correcting part of the Casimir force presents a sudden change in the transition from regular to chaotic geometries. This suggests that there could be signatures of quantum chaos in the Casimir effect.

  12. Protective Forces | National Nuclear Security Administration | (NNSA)

    National Nuclear Security Administration (NNSA)

    Protective Forces NNSA has some of the best trained and best equipped forces protecting its nuclear weapons and material. Since the events of September 11, 2001, NNSA has hired additional armed security police officers. It has also shifted towards a paramilitary, "tactical response force" that utilizes a robust mix of offensive and defensive qualified officers who are well-trained in small team and weapons tactics. It has improved its training capabilities by expanding training ranges

  13. ARM - PI Product - Direct Aerosol Forcing Uncertainty

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ProductsDirect Aerosol Forcing Uncertainty ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send PI Product : Direct Aerosol Forcing Uncertainty Understanding sources of uncertainty in aerosol direct radiative forcing (DRF), the difference in a given radiative flux component with and without aerosol, is essential to quantifying changes in Earth's radiation budget. We examine the uncertainty in DRF due to measurement

  14. Sandia Energy - Air Force Research Laboratory Testing

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    from the Air Force Research Laboratory in Albuquerque utilized the site at the National Solar Thermal Test Facility to evaluate seismic and optical activity from explosives set...

  15. Sandia Energy - Air Force Research Laboratory Testing

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    the Air Force Research Laboratory (AFRL) in Albuquerque utilized the site at the National Solar Thermal Test Facility (NSTTF) to evaluate seismic and optical activity from...

  16. Weardale Task Force | Open Energy Information

    Open Energy Info (EERE)

    that is developing a sustainable community in the East gate area which will be run on wind, solar, biomass, geothermal and hydro power. References: Weardale Task Force1...

  17. Nuclear Radiological Threat Task Force Established | National...

    National Nuclear Security Administration (NNSA)

    Nuclear Radiological Threat Task Force Established Washington, DC NNSA's Administrator Linton Brooks announces the establishment of the Nuclear Radiological Threat Reduction Task ...

  18. Interagency Energy Management Task Force Members

    Broader source: Energy.gov [DOE]

    The Interagency Energy Management Task Force is led by the Federal Energy Management Program director. Members include energy and sustainability managers from federal agencies.

  19. Elastic actuator for precise force control

    DOE Patents [OSTI]

    Pratt, G.A.; Williamson, M.M.

    1997-07-22

    The invention provides an elastic actuator consisting of a motor and a motor drive transmission connected at an output of the motor. An elastic element is connected in series with the motor drive transmission, and this elastic element is positioned to alone support the full weight of any load connected at an output of the actuator. A single force transducer is positioned at a point between a mount for the motor and an output of the actuator. This force transducer generates a force signal, based on deflection of the elastic element, that indicates force applied by the elastic element to an output of the actuator. An active feedback force control loop is connected between the force transducer and the motor for controlling the motor. This motor control is based on the force signal to deflect the elastic element an amount that produces a desired actuator output force. The produced output force is substantially independent of load motion. The invention also provides a torsional spring consisting of a flexible structure having at least three flat sections each connected integrally with and extending radially from a central section. Each flat section extends axially along the central section from a distal end of the central section to a proximal end of the central section. 30 figs.

  20. Elastic actuator for precise force control

    DOE Patents [OSTI]

    Pratt, Gill A.; Williamson, Matthew M.

    1997-07-22

    The invention provides an elastic actuator consisting of a motor and a motor drive transmission connected at an output of the motor. An elastic element is connected in series with the motor drive transmission, and this elastic element is positioned to alone support the full weight of any load connected at an output of the actuator. A single force transducer is positioned at a point between a mount for the motor and an output of the actuator. This force transducer generates a force signal, based on deflection of the elastic element, that indicates force applied by the elastic element to an output of the actuator. An active feedback force control loop is connected between the force transducer and the motor for controlling the motor. This motor control is based on the force signal to deflect the elastic element an amount that produces a desired actuator output force. The produced output force is substantially independent of load motion. The invention also provides a torsional spring consisting of a flexible structure having at least three flat sections each connected integrally with and extending radially from a central section. Each flat section extends axially along the central section from a distal end of the central section to a proximal end of the central section.

  1. Muon Collider Task Force Report

    SciTech Connect (OSTI)

    Ankenbrandt, C.; Alexahin, Y.; Balbekov, V.; Barzi, E.; Bhat, C.; Broemmelsiek, D.; Bross, A.; Burov, A.; Drozhdin, A.; Finley, D.; Geer, S.; /Fermilab /Argonne /Brookhaven /Jefferson Lab /LBL, Berkeley /MUONS Inc., Batavia /UCLA /UC, Riverside /Mississippi U.

    2007-12-01

    Muon Colliders offer a possible long term path to lepton-lepton collisions at center-of-mass energies {radical}s {ge} 1 TeV. In October 2006 the Muon Collider Task Force (MCTF) proposed a program of advanced accelerator R&D aimed at developing the Muon Collider concept. The proposed R&D program was motivated by progress on Muon Collider design in general, and in particular, by new ideas that have emerged on muon cooling channel design. The scope of the proposed MCTF R&D program includes muon collider design studies, helical cooling channel design and simulation, high temperature superconducting solenoid studies, an experimental program using beams to test cooling channel RF cavities and a 6D cooling demonstration channel. The first year of MCTF activities are summarized in this report together with a brief description of the anticipated FY08 R&D activities. In its first year the MCTF has made progress on (1) Muon Collider ring studies, (2) 6D cooling channel design and simulation studies with an emphasis on the HCC scheme, (3) beam preparations for the first HPRF cavity beam test, (4) preparations for an HCC four-coil test, (5) further development of the MANX experiment ideas and studies of the muon beam possibilities at Fermilab, (6) studies of how to integrate RF into an HCC in preparation for a component development program, and (7) HTS conductor and magnet studies to prepare for an evaluation of the prospects for of an HTS high-field solenoid build for a muon cooling channel.

  2. Direct imaging of enhanced current collection on grain boundaries of Cu(In,Ga)Se{sub 2} solar cells

    SciTech Connect (OSTI)

    Kim, JunHo; Kim, SeongYeon; Jiang, Chun-Sheng; Ramanathan, Kannan; Al-Jassim, Mowafak M.

    2014-02-10

    We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se{sub 2} solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.

  3. MEAM interatomic force calculation subroutine for LAMMPS

    Energy Science and Technology Software Center (OSTI)

    2010-10-25

    Interatomic force and energy calculation subroutine tobe used with the molecular dynamics simulation code LAMMPS (Ref a.). The code evaluates the total energy and atomic forces (energy gradient) according to cubic spine-based variant (Ref b.) of the Modified Embedded Atom Method (MEAM).

  4. armed forces | National Nuclear Security Administration

    National Nuclear Security Administration (NNSA)

    armed forces CNS employees greet Honor Air veterans Y-12 Deputy Site Manager Gene Sievers, left, and ProForce's Neal Wolfenbarger pose for photo at McGhee Tyson Airport in Knoxville, TN, as Wolfenbarger waits on his uncle to return from Washington, D.C. Veterans Day is important to all Americans, but it carries an even more elevated meaning to those

  5. Macroscopic model of scanning force microscope

    DOE Patents [OSTI]

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  6. Measurement of tool forces in diamond turning

    SciTech Connect (OSTI)

    Drescher, J.; Dow, T.A.

    1988-12-01

    A dynamometer has been designed and built to measure forces in diamond turning. The design includes a 3-component, piezoelectric transducer. Initial experiments with this dynamometer system included verification of its predicted dynamic characteristics as well as a detailed study of cutting parameters. Many cutting experiments have been conducted on OFHC Copper and 6061-T6 Aluminum. Tests have involved investigation of velocity effects, and the effects of depth and feedrate on tool forces. Velocity has been determined to have negligible effects between 4 and 21 m/s. Forces generally increase with increasing depth of cut. Increasing feedrate does not necessarily lead to higher forces. Results suggest that a simple model may not be sufficient to describe the forces produced in the diamond turning process.

  7. Focused ion beam and scanning electron microscopy for 3D materials...

    Office of Scientific and Technical Information (OSTI)

    microscopy for 3D materials characterization. Citation Details In-Document Search Title: Focused ion beam and scanning electron microscopy for 3D materials characterization. ...

  8. Biological Applications and Transmission Electron Microscopy Investigations of Mesoporous Silica Nanoparticles

    SciTech Connect (OSTI)

    Brian G. Trewyn

    2006-05-01

    antioxidant dependent release was measured. Finally, the biological interaction of the material was determined along with TEM measurements. An electron investigation proved that the pore openings of the MSN were indeed blocked by the Fe{sub 3}O{sub 4} nanoparticles. The biological interaction investigation demonstrated Fe{sub 3}O{sub 4}-capped MSN endocytosis into HeLa cells. Not only does the material enter the cells through endocytosis, but it seems that fluorescein was released from the pores most probably caused by disulfide bond reducing molecules, antioxidants. In addition to endocytosis and release, the Fe{sub 3}O{sub 4}-capped MSN propelled the cells across a cuvette upon induction of a magnet force. Finally, an important aspect of materials characterization is transmission electron microscopy. A TEM investigation demonstrated that incorporating different functional groups during the synthesis (co-condensation) changed the particle and pore morphologies.

  9. Imaging hydrated microbial extracellular polymers: Comparative analysis by electron microscopy

    SciTech Connect (OSTI)

    Dohnalkova, A.C.; Marshall, M. J.; Arey, B. W.; Williams, K. H.; Buck, E. C.; Fredrickson, J. K.

    2011-01-01

    Microbe-mineral and -metal interactions represent a major intersection between the biosphere and geosphere but require high-resolution imaging and analytical tools for investigating microscale associations. Electron microscopy has been used extensively for geomicrobial investigations and although used bona fide, the traditional methods of sample preparation do not preserve the native morphology of microbiological components, especially extracellular polymers. Herein, we present a direct comparative analysis of microbial interactions using conventional electron microscopy approaches of imaging at room temperature and a suite of cryogenic electron microscopy methods providing imaging in the close-to-natural hydrated state. In situ, we observed an irreversible transformation of the hydrated bacterial extracellular polymers during the traditional dehydration-based sample preparation that resulted in their collapse into filamentous structures. Dehydration-induced polymer collapse can lead to inaccurate spatial relationships and hence could subsequently affect conclusions regarding nature of interactions between microbial extracellular polymers and their environment.

  10. Photothermal single particle microscopy using a single laser beam

    SciTech Connect (OSTI)

    Selmke, Markus; Heber, André; Braun, Marco; Cichos, Frank

    2014-07-07

    We introduce a single-laser-beam photothermal microscopy scheme for the detection of single absorbing nano-objects. Here, a modulated incident laser beam with a constant intensity offset serves as pump and probe beam at the same time. Using the out-of-phase scattering response of the retarded thermorefractive wave field, the method provides a selective contrast for absorbers over a possible background of scatterers. The use of a single wavelength and a single beam, considerably simplifies the setup and integration of photothermal detection in existing microscopy schemes.

  11. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes

  12. Variable temperature electrochemical strain microscopy of Sm-doped ceria

    SciTech Connect (OSTI)

    Jesse, Stephen; Morozovska, A. N.; Kalinin, Sergei V; Eliseev, E. A.; Yang, Nan; Doria, Sandra; Tebano, Antonello

    2013-01-01

    Variable temperature electrochemical strain microscopy has been used to study the electrochemical activity of Sm-doped ceria as a function of temperature and bias. The electrochemical strain microscopy hysteresis loops have been collected across the surface at different temperatures and the relative activity at different temperatures has been compared. The relaxation behavior of the signal at different temperatures has been also evaluated to relate kinetic process during bias induced electrochemical reactions with temperature and two different kinetic regimes have been identified. The strongly non-monotonic dependence of relaxation behavior on temperature is interpreted as evidence for water-mediated mechanisms.

  13. Untitled Document

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Digital Instruments Scanning Probe Microscopy with AFM capabilties and Hysitron Nano Indenter Back to Equipment

  14. air force | National Nuclear Security Administration

    National Nuclear Security Administration (NNSA)

    air force NNSA, Air Force Complete Successful B61-12 Life Extension Program Development Flight Test at Tonopah Test Range WASHINGTON - The National Nuclear Security Administration (NNSA) and United States Air Force completed the third development flight test of a non-nuclear B61-12 nuclear gravity bomb at Tonopah Test Range in Nevada on October 20, 2015. "This demonstration of effective end-to-end system... The man who trains everyone on the bombs Mark Meyer, training coordinator and field

  15. Band excitation method applicable to scanning probe microscopy

    SciTech Connect (OSTI)

    Jesse, Stephen; Kalinin, Sergei V.

    2015-08-04

    Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.

  16. A national facility for biological cryo-electron microscopy

    SciTech Connect (OSTI)

    Saibil, Helen R.; Grnewald, Kay; Stuart, David I.

    2015-01-01

    This review provides a brief update on the use of cryo-electron microscopy for integrated structural biology, along with an overview of the plans for the UK national facility for electron microscopy being built at the Diamond synchrotron. Three-dimensional electron microscopy is an enormously powerful tool for structural biologists. It is now able to provide an understanding of the molecular machinery of cells, disease processes and the actions of pathogenic organisms from atomic detail through to the cellular context. However, cutting-edge research in this field requires very substantial resources for equipment, infrastructure and expertise. Here, a brief overview is provided of the plans for a UK national three-dimensional electron-microscopy facility for integrated structural biology to enable internationally leading research on the machinery of life. State-of-the-art equipment operated with expert support will be provided, optimized for both atomic-level single-particle analysis of purified macromolecules and complexes and for tomography of cell sections. The access to and organization of the facility will be modelled on the highly successful macromolecular crystallography (MX) synchrotron beamlines, and will be embedded at the Diamond Light Source, facilitating the development of user-friendly workflows providing near-real-time experimental feedback.

  17. SCM Forcing Data Derived from NWP Analyses

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Jakob, Christian

    2008-01-15

    Forcing data, suitable for use with single column models (SCMs) and cloud resolving models (CRMs), have been derived from NWP analyses for the ARM (Atmospheric Radiation Measurement) Tropical Western Pacific (TWP) sites of Manus Island and Nauru.

  18. Force 9 Energy | Open Energy Information

    Open Energy Info (EERE)

    9 Energy Jump to: navigation, search Name: Force 9 Energy Place: Amersham, United Kingdom Zip: HP7 0UT Sector: Wind energy Product: Joint owner of Abercairny windfarm development....

  19. Micromechanical apparatus for measurement of forces (Patent)...

    Office of Scientific and Technical Information (OSTI)

    deflection element (e.g. a ring or annulus) suspended above a substrate for deflection by an applied force, and one or more distance scales for optically measuring the deflection. ...

  20. Solar Trackers at Nellis Air Force Base

    Broader source: Energy.gov [DOE]

    This photograph features one of many SunPower T20 Tracker that are part of the 14.2-megawatt photovoltaic (PV) systems installed at Nellis Air Force Base in Nevada, which was the largest PV system...

  1. Clinch River MRS Task Force Recommendations

    Broader source: Energy.gov [DOE]

    The Clinch River HRS Task Force was appointed in July 1985 by the Roane County Executive and the Oak Ridge City Council to evaluate the Monitored Retrievable Storage (MRS) facility proposed by the...

  2. protective force | National Nuclear Security Administration

    National Nuclear Security Administration (NNSA)

    The Protective Force successfully completed a recent assessment by the U.S. Department of Energy's Office of Enterprise Assessments. The Pantex Plant recently hosted the U.S. ...

  3. Fabrication Of Surface Bumps On A Capsule To Simulate Fill Tube...

    Office of Scientific and Technical Information (OSTI)

    The bumps were characterized using interference microscopy and AFM. Authors: Letts, S ; ... FABRICATION; HYDRODYNAMICS; INSTABILITY; MASS DEFECT; MICROSCOPY; PLASMA; POLYMERS

  4. Attack optimization at moderate force levels

    SciTech Connect (OSTI)

    Canavan, G.H.

    1997-04-01

    Optimal offensive missile allocations for moderate offensive and defensive forces are derived and used to study their sensitivity to force structure parameters levels. It is shown that the first strike cost is a product of the number of missiles and a function of the optimum allocation. Thus, the conditions under which the number of missiles should increase or decrease in time is also determined by this allocation.

  5. DOE Contractor Work Force Restructuring Approval Thresholds

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Contractor Work Force Restructuring Approval Thresholds Up to 100 employees Contractor can make decision bit must notify DOE of intent of restructuring 101-200 employees DOE/NNSA field office is authorized to provide approval 201-500 employees LM is authorized to provide approval and NNSA Administrator is authorized to provide approval for NNSA work force restructurings in consultation with LM 501 and above employees Under Secretary/NNSA Administrator approval required

  6. Micromechanical apparatus for measurement of forces

    DOE Patents [OSTI]

    Tanner, Danelle Mary; Allen, James Joe

    2004-05-25

    A new class of micromechanical dynamometers has been disclosed which are particularly suited to fabrication in parallel with other microelectromechanical apparatus. Forces in the microNewton regime and below can be measured with such dynamometers which are based on a high-compliance deflection element (e.g. a ring or annulus) suspended above a substrate for deflection by an applied force, and one or more distance scales for optically measuring the deflection.

  7. Photothermal excitation setup for a modified commercial atomic force microscope

    SciTech Connect (OSTI)

    Adam, Holger; Rode, Sebastian; Schreiber, Martin; Kühnle, Angelika; Kobayashi, Kei; Yamada, Hirofumi

    2014-02-15

    High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and to maintain the low noise level of the original setup with a typical deflection noise density of about 15 fm/√(Hz) measured in aqueous solution. The success of the modification is illustrated by a comparison of the resonance spectra obtained with piezoelectric and photothermal excitation. The performance of the systems is demonstrated by presenting high-resolution images on bare calcite in liquid as well as organic adsorbates (Alizarin Red S) on calcite with simultaneous atomic resolution of the underlying calcite substrate.

  8. Biological imaging by soft x-ray diffraction microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Shapiro, D.; Thibault, P.; Beetz, T.; Elser, V.; Howells, M.; Jacobsen, C.; Kirz, J.; Lima, E.; Miao, H.; Neiman, A. M.; et al

    2005-10-25

    We have used the method of x-ray diffraction microscopy to image the complex-valued exit wave of an intact and unstained yeast cell. The images of the freeze-dried cell, obtained by using 750-eV x-rays from different angular orientations, portray several of the cell's major internal components to 30-nm resolution. The good agreement among the independently recovered structures demonstrates the accuracy of the imaging technique. To obtain the best possible reconstructions, we have implemented procedures for handling noisy and incomplete diffraction data, and we propose a method for determining the reconstructed resolution. This work represents a previously uncharacterized application of x-ray diffractionmore » microscopy to a specimen of this complexity and provides confidence in the feasibility of the ultimate goal of imaging biological specimens at 10-nm resolution in three dimensions.« less

  9. Microscopy with slow electrons: from LEEM to XPEEM

    ScienceCinema (OSTI)

    Bauer, Ernst [Arizona State University, Phoenix, Arizona, United States

    2010-01-08

    The short penetration and escape depth of electrons with energies below 1 keV make them ideally suited for the study of surfaces and ultrathin films. The combination of the low energy electrons and the high lateral resolution of a microscope produces a powerful method for the characterization of nanostructures on bulk samples, in particular if the microscope is equipped with an imaging energy filter and connected to a synchrotron radiation source. Comprehensive characterization by imaging, diffraction, and spectroscope of the structural, chemical, and magnetic properties is then possible. The Talk will describe the various imaging techniques in using reflected and emitted electrons in low-energy electron microscopy (LEEM) and x-ray photoemission electron microscopy (XPEEM), with an emphasis on magnetic materials with spin-polarized LEEM and x-ray magnetic circular dichroism PEEM. The talk with end with an outlook on future possibilities.

  10. Microfabricated high-bandpass foucault aperture for electron microscopy

    DOE Patents [OSTI]

    Glaeser, Robert; Cambie, Rossana; Jin, Jian

    2014-08-26

    A variant of the Foucault (knife-edge) aperture is disclosed that is designed to provide single-sideband (SSB) contrast at low spatial frequencies but retain conventional double-sideband (DSB) contrast at high spatial frequencies in transmission electron microscopy. The aperture includes a plate with an inner open area, a support extending from the plate at an edge of the open area, a half-circle feature mounted on the support and located at the center of the aperture open area. The radius of the half-circle portion of reciprocal space that is blocked by the aperture can be varied to suit the needs of electron microscopy investigation. The aperture is fabricated from conductive material which is preferably non-oxidizing, such as gold, for example.

  11. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the

  12. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the

  13. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing short-exposure nanoscale images of the magnetic structure of materials. The new method combines aspects of coherent x-ray diffraction, which can determine 3-D charge distributions, and resonant magnetic scattering, which is sensitive to magnetic structures. Physicists have used coherent x-ray diffraction to measure the

  14. Studying localized corrosion using liquid cell transmission electron microscopy

    SciTech Connect (OSTI)

    Chee, See Wee; Pratt, Sarah H.; Hattar, Khalid; Duquette, David; Ross, Frances M.; Hull, Robert

    2014-11-07

    Using liquid cell transmission electron microscopy (LCTEM), localized corrosion of Cu and Al thin films immersed in aqueous NaCl solutions was studied. We demonstrate that potentiostatic control can be used to initiate pitting and that local compositional changes, due to focused ion beam implantation of Au+ ions, can modify the corrosion susceptibility of Al films. Likewise, a discussion on strategies to control the onset of pitting is also presented.

  15. Studying localized corrosion using liquid cell transmission electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Chee, See Wee; Pratt, Sarah H.; Hattar, Khalid; Duquette, David; Ross, Frances M.; Hull, Robert

    2014-11-07

    Using liquid cell transmission electron microscopy (LCTEM), localized corrosion of Cu and Al thin films immersed in aqueous NaCl solutions was studied. We demonstrate that potentiostatic control can be used to initiate pitting and that local compositional changes, due to focused ion beam implantation of Au+ ions, can modify the corrosion susceptibility of Al films. Likewise, a discussion on strategies to control the onset of pitting is also presented.

  16. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations

  17. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations

  18. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations

  19. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations

  20. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations

  1. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations

  2. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations

  3. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with nanometer-scale resolution in three dimensions nonperiodic objects that are several microns in size. To fill this gap, the technique of coherent x-ray diffraction imaging now under development takes advantage of the penetrating power of x rays while simultaneously removing the limitations

  4. Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Jesse, S.; Chi, M.; Belianinov, A.; Beekman, C.; Kalinin, S. V.; Borisevich, A. Y.; Lupini, A. R.

    2016-05-23

    Electron microscopy is undergoing a transition; from the model of producing only a few micrographs, through the current state where many images and spectra can be digitally recorded, to a new mode where very large volumes of data (movies, ptychographic and multi-dimensional series) can be rapidly obtained. In this paper, we discuss the application of so-called “big-data” methods to high dimensional microscopy data, using unsupervised multivariate statistical techniques, in order to explore salient image features in a specific example of BiFeO3 domains. Remarkably, k-means clustering reveals domain differentiation despite the fact that the algorithm is purely statistical in nature andmore » does not require any prior information regarding the material, any coexisting phases, or any differentiating structures. While this is a somewhat trivial case, this example signifies the extraction of useful physical and structural information without any prior bias regarding the sample or the instrumental modality. Further interpretation of these types of results may still require human intervention. Finally, however, the open nature of this algorithm and its wide availability, enable broad collaborations and exploratory work necessary to enable efficient data analysis in electron microscopy.« less

  5. Single beam Fourier transform digital holographic quantitative phase microscopy

    SciTech Connect (OSTI)

    Anand, A. Chhaniwal, V. K.; Mahajan, S.; Trivedi, V.; Faridian, A.; Pedrini, G.; Osten, W.; Dubey, S. K.; Javidi, B.

    2014-03-10

    Quantitative phase contrast microscopy reveals thickness or height information of a biological or technical micro-object under investigation. The information obtained from this process provides a means to study their dynamics. Digital holographic (DH) microscopy is one of the most used, state of the art single-shot quantitative techniques for three dimensional imaging of living cells. Conventional off axis DH microscopy directly provides phase contrast images of the objects. However, this process requires two separate beams and their ratio adjustment for high contrast interference fringes. Also the use of two separate beams may make the system more vulnerable to vibrations. Single beam techniques can overcome these hurdles while remaining compact as well. Here, we describe the development of a single beam DH microscope providing whole field imaging of micro-objects. A hologram of the magnified object projected on to a diffuser co-located with a pinhole is recorded with the use of a commercially available diode laser and an arrayed sensor. A Fourier transform of the recorded hologram directly yields the complex amplitude at the image plane. The method proposed was investigated using various phase objects. It was also used to image the dynamics of human red blood cells in which sub-micrometer level thickness variation were measurable.

  6. Electrochemistry on the nanoscale: the force dimension (Journal...

    Office of Scientific and Technical Information (OSTI)

    Electrochemistry on the nanoscale: the force dimension Citation Details In-Document Search Title: Electrochemistry on the nanoscale: the force dimension Authors: Black, Jennifer M ...

  7. Electrochemistry at the Nanoscale: The Force Dimension (Journal...

    Office of Scientific and Technical Information (OSTI)

    Electrochemistry at the Nanoscale: The Force Dimension Citation Details In-Document Search Title: Electrochemistry at the Nanoscale: The Force Dimension Authors: Black, Jennifer M ...

  8. Climate Change Task Force Webinar Series | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    State, Local, and Tribal Leaders Task Force on Climate Preparedness and Resilience. ... Task Force on Climate Preparedness and Resilience, established by an Executive Order in ...

  9. Radiative Forcing of Climate Change (Book) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Visit OSTI to utilize additional information resources in energy science and technology. A ... Forcings due to Chemistry 6.7 The Direct Radiative Forcing of Tropospheric ...

  10. FORCE RECONSTRUCTION USING THE SUM OF WEIGHTED ACCELERATIONS

    Office of Scientific and Technical Information (OSTI)

    to produce the reconstructed and to mitigate the shock to the interiorcomponents. force. ... the impact forces so that interior components can be designed to withstand the shock. ...

  11. Task Force on Climate Preparedness and Resilience Announces Tribal...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Task Force on Climate Preparedness and Resilience Announces Tribal Climate Resilience Program Task Force on Climate Preparedness and Resilience Announces Tribal Climate Resilience ...

  12. Coating thickness and coverage effects on the forces between...

    Office of Scientific and Technical Information (OSTI)

    forces between silica nanoparticles in water. Citation Details In-Document Search Title: Coating thickness and coverage effects on the forces between silica nanoparticles in water. ...

  13. Linkage to Previous International PV Module QA Task Force Workshops...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Linkage to Previous International PV Module QA Task Force Workshops: Proposal for Rating System Linkage to Previous International PV Module QA Task Force Workshops: Proposal for ...

  14. Air Force Achieves Fuel Efficiency through Industry Best Practices...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Force Achieves Fuel Efficiency through Industry Best Practices Air Force Achieves Fuel Efficiency through Industry Best Practices Fact sheet offers an overview of the U.S. Air ...

  15. Before Senate Subcommittee on Strategic Forces - Committee on...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    on Strategic Forces - Committee on Armed Services Before Senate Subcommittee on Strategic Forces - Committee on Armed Services By: David Huizenga, Senior Advisor for...

  16. Nuclear Forces and High-Performance Computing: The Perfect Match...

    Office of Scientific and Technical Information (OSTI)

    Conference: Nuclear Forces and High-Performance Computing: The Perfect Match Citation Details In-Document Search Title: Nuclear Forces and High-Performance Computing: The Perfect ...

  17. Dyess Air Force Base Water Conservation and Green Energy | Department...

    Energy Savers [EERE]

    Dyess Air Force Base Water Conservation and Green Energy Dyess Air Force Base Water Conservation and Green Energy Fact sheet describes the Federal Energy Management Program (FEMP) ...

  18. Collaborative Utility Task Force Partners with DOE to Develop...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Collaborative Utility Task Force Partners with DOE to Develop Cyber Security Requirements for Advanced Metering Infrastructure Collaborative Utility Task Force Partners with DOE to ...

  19. Collective behaviors of the Casimir force in microelectromechanical...

    Office of Scientific and Technical Information (OSTI)

    Collective behaviors of the Casimir force in microelectromechanical systems Citation Details In-Document Search Title: Collective behaviors of the Casimir force in ...

  20. Clean Air Task Force CATF | Open Energy Information

    Open Energy Info (EERE)

    Force (CATF) Place: Boston, Massachusetts Zip: 2108 Product: Massachusetts-based scientific research and legal advocacy center. References: Clean Air Task Force (CATF)1 This...

  1. Government and Industry A Force for Collaboration at the Energy...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Government and Industry A Force for Collaboration at the Energy Roadmap Update Workshop Government and Industry A Force for Collaboration at the Energy Roadmap Update Workshop ...

  2. Federal Task Force Sends Recommendations to President on Fostering...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Federal Task Force Sends Recommendations to President on Fostering Clean Coal Technology Federal Task Force Sends Recommendations to President on Fostering Clean Coal Technology ...

  3. Implementation Plan, 29 Recommendations of the Protective Force...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Implementation Plan, 29 Recommendations of the Protective Force Career Options Study Group - January 2011 Implementation Plan, 29 Recommendations of the Protective Force Career...

  4. Protective Force Protocols for ESS Supported Performance Tests...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Protective Force Protocols for ESS Supported Performance Tests and Exercises, March 12, 2007 Protective Force Protocols for ESS Supported Performance Tests and Exercises, March 12, ...

  5. Electrodynamic force of dielectric barrier discharge

    SciTech Connect (OSTI)

    Shang, J. S.; Roveda, F.; Huang, P. G.

    2011-06-01

    The periodic electrostatic force of dielectric barrier discharge (DBD) in nitrogen for flow control is investigated by a system of physics-based, two-dimensional model equations. The plasma generation process of DBD is mainly the avalanche growth of electrons through the secondary emission from cathode. Therefore, the charged particle motion of a succession of random micro discharges can be approximated by the drift-diffusion model. The force of DBD generated by charge separation and accumulation over the dielectrics is obtained by solving the model equations with the rigorous media interface boundary condition of Maxwell equations in the time domain. The discharge structure and force components by different electrical permittivity and amplitudes of externally applied electrical potential are delineated and quantified.

  6. Spray bottle apparatus with force multiply pistons

    DOE Patents [OSTI]

    Eschbach, Eugene A.

    1992-01-01

    The present invention comprises a spray bottle in which the pressure resulting from the gripping force applied by the user is amplified and this increased pressure used in generating a spray such as an aerosol or fluid stream. In its preferred embodiment, the invention includes a high pressure chamber and a corresponding piston which is operative for driving fluid out of this chamber at high pressure through a spray nozzle and a low pressure chamber and corresponding piston which is acted upon by the hydraulic pressure within the bottle resulting from the gripping force. The low pressure chamber and piston are of larger size than the high pressure chamber and piston. The pistons are rigidly connected so that the force created by the pressure acting on the piston in the low pressure chamber is transmitted to the piston in the high pressure chamber where it is applied over a more limited area thereby generating greater hydraulic pressure for use in forming the spray.

  7. Alternative polymer separation technology by centrifugal force in a melted state

    SciTech Connect (OSTI)

    Dobrovszky, Károly; Ronkay, Ferenc

    2014-11-15

    Highlights: • Waste separation should take place at high purity. • Developed a novel, alternative separation method, where the separation occurred in a melted state by centrifugal forces. • Possibility of separation two different plastics into neat fractions. • High purity fractions were established at granulates and also at prefabricated blend. • Results were verified by DSC, optical microscopy and Raman spectroscopy. - Abstract: In order to upgrade polymer waste during recycling, separation should take place at high purity. The present research was aimed to develop a novel, alternative separation opportunity, where the polymer fractions were separated by centrifugal force in melted state. The efficiency of the constructed separation equipment was verified by two immiscible plastics (polyethylene terephthalate, PET; low density polyethylene, LDPE), which have a high difference of density, and of which large quantities can also be found in the municipal solid waste. The results show that the developed equipment is suitable not only for separating dry blended mixtures of PET/LDPE into pure components again, but also for separating prefabricated polymer blends. By this process it becomes possible to recover pure polymer substances from multi-component products during the recycling process. The adequacy of results was verified by differential scanning calorimetry (DSC) measurement as well as optical microscopy and Raman spectroscopy.

  8. Protective Force Contingency Planning Technical Standard

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    DOE STANDARD PROTECTIVE FORCE CONTINGENCY PLANNING TECHNICAL STANDARD U.S. Department of Energy Washington, D.C. 20585 DOE-STD-1213-2014 JULY 2014 ──────────────── CHANGE NOTICE NO.1 SEPTEMBER 2015 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. NOT MEASUREMENT SENSITIVE This page intentionally left blank. DOE-STD-1213-2014 i ATTACHMENT 1 Change Notice No. 1 DOE-STD-1213-2014 September 2015 Protective Force Contingency Planning

  9. Unveiling Stability Criteria of DNA-Carbon Nanotubes Constructs by Scanning Tunneling Microscopy and Computational Modeling

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Kilina, Svetlana; Yarotski, Dzmitry A.; Talin, A. Alec; Tretiak, Sergei; Taylor, Antoinette J.; Balatsky, Alexander V.

    2011-01-01

    We present a combined approach that relies on computational simulations and scanning tunneling microscopy (STM) measurements to reveal morphological properties and stability criteria of carbon nanotube-DNA (CNT-DNA) constructs. Application of STM allows direct observation of very stable CNT-DNA hybrid structures with the well-defined DNA wrapping angle of 63.4 ° and a coiling period of 3.3 nm. Using force field simulations, we determine how the DNA-CNT binding energy depends on the sequence and binding geometry of a single strand DNA. This dependence allows us to quantitatively characterize the stability of a hybrid structure with an optimal π-stacking between DNA nucleotides andmore » the tube surface and better interpret STM data. Our simulations clearly demonstrate the existence of a very stable DNA binding geometry for (6,5) CNT as evidenced by the presence of a well-defined minimum in the binding energy as a function of an angle between DNA strand and the nanotube chiral vector. This novel approach demonstrates the feasibility of CNT-DNA geometry studies with subnanometer resolution and paves the way towards complete characterization of the structural and electronic properties of drug-delivering systems based on DNA-CNT hybrids as a function of DNA sequence and a nanotube chirality.« less

  10. In situ microscopy of the self-assembly of branched nanocrystals in solution

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Sutter, Eli; Tkachenko, Alexei V.; Sutter, Peter; Roman Krahne; Arciniegas, Milena; Manna, Liberato; de Graaf, Joost

    2016-04-04

    Here, solution-phase self-assembly of nanocrystals into mesoscale structures is a promising strategy for constructing functional materials from nanoscale components. Liquid environments are key to self-assembly since they allow suspended nanocrystals to diffuse and interact freely, but they also complicate experiments. Real-time observations with single-particle resolution could have transformative impact on our understanding of nanocrystal self-assembly. Here we use real-time in situ imaging by liquid-cell electron microscopy to elucidate the nucleation and growth mechanism and properties of linear chains of octapod-shaped nanocrystals in their native solution environment. Statistical mechanics modelling based on these observations and using the measured chain-length distribution clarifiesmore » the relative importance of dipolar and entropic forces in the assembly process and gives direct access to the interparticle interaction. Our results suggest that monomer-resolved in situ imaging combined with modelling can provide unprecedented quantitative insight into the microscopic processes and interactions that govern nanocrystal self-assembly in solution.« less

  11. Strategic forces: Future requirements and options

    SciTech Connect (OSTI)

    Speed, R.D.

    1990-11-01

    In the wake of the collapse of the Warsaw Pact and the apparent ending of the Cold War, there have been renewed calls for radical cuts in US strategic forces to levels far below the 10,000 or so warheads allowed each side under the current START proposal. Since it now appears that NATO for the first time will have the capability to defeat a Soviet conventional attack without the necessity of threatening to resort to nuclear weapons, this should pave the way for the rethinking of US strategy and the reduction of US strategic weapons requirements. In this new environment, it seems plausible that, with a modification of the Flexible Response doctrine to forego attempts to disarm the Soviet Union, deterrence could be maintained with 1500 or so survivable strategic weapons. With a new strategy that confined US strategic weapons to the role of deterring the use of nuclear weapons by other countries, a survivable force of about 500 weapons would seem sufficient. With this premise, the implications for the US strategic force structure are examined for two cases: a treaty that allows each side 3000 warheads and one that allows each side 1000 warheads. In Part 1 of this paper, the weapons requirements for deterrence are examined in light of recent changes in the geopolitical environment. In Part 2, it is assumed that the President and Congress have decided that deep cuts in strategic forces are acceptable. 128 refs., 12 figs., 12 tabs. (JF)

  12. Direct Lorentz force compensation flowmeter for electrolytes

    SciTech Connect (OSTI)

    Vasilyan, S. Froehlich, Th.

    2014-12-01

    A simplified method of contactless Lorentz force (LF) measurements for flow meters on electrolytes is described and realized. Modification and comparative representation are discussed against recently well-developed methods. Based on the catapult effect, that current carrying conductor experiences a repulsive force in a magnetic field, we demonstrate force measurement method of LF velocimetry applications by commonly known electromagnetic force compensation principle. Measurement approach through zero point stability is considered to minimize mechanical influences and avoid gravimetric uncertainties. Here, the current carrying wires are static fixed in the vicinity of magnet system at zero point stable position, while occurring deflection of magnets by electrolyte flow is compensated by external applied current within wires. Measurements performed by developed servo-system which drives control loop by means of optical position sensor for simplified (i) single wire and (ii) coil-like extended compensation schemes. Guided by experiments on electrolyte flow, we demonstrate the applicability of adopted principle for conductivities ranging from 2 to 20?S/m. Further improvements are discussed in agreement with the parameters of demonstration setup, straightforward theory, and experimental results. We argue that this method is potentially suitable for: (a) applications with higher conductivity like molten metal (order of 10{sup 6?}S/m) assuming spatial configuration of setup and (b) for lower range of conductivity (below 1?S/m) while this is strongly subject to stiffness of system and noise mainly mechanical and thermal radiations.

  13. Protective Force Contingency Planning Technical Standard

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    NOT MEASUREMENT SENSITIVE DOE-STD-1213-2014 July 2014 DOE HANDBOOK PROTECTIVE FORCE CONTINGENCY PLANNING TECHNICAL STANDARD U.S. Department of Energy Washington, D.C. 20585 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. This page intentionally left blank. DOE-STD-1213-2014 i CONTENTS FOREWORD .............................................................................................................................v 1. INTRODUCTION

  14. U.S. Transport Task Force 2010

    SciTech Connect (OSTI)

    Diamond, P.H.

    2011-09-21

    The Transport Task Force (TTF) Meeting is a venue for vigorous scientific discourse and discussion on topics in transport and turbulence in fusion plasmas. Its participation is international. The 2010 meeting was highly effective, with 139 registered participants and 131 presentations. This is remarkable for an even year (IAEA year) meeting. The meeting clearly fostered progress in understanding and control of turbulent transport.

  15. Invited Review Article: Advanced light microscopy for biological space research

    SciTech Connect (OSTI)

    De Vos, Winnok H.; Beghuin, Didier; Schwarz, Christian J.; Jones, David B.; Loon, Jack J. W. A. van

    2014-10-15

    As commercial space flights have become feasible and long-term extraterrestrial missions are planned, it is imperative that the impact of space travel and the space environment on human physiology be thoroughly characterized. Scrutinizing the effects of potentially detrimental factors such as ionizing radiation and microgravity at the cellular and tissue level demands adequate visualization technology. Advanced light microscopy (ALM) is the leading tool for non-destructive structural and functional investigation of static as well as dynamic biological systems. In recent years, technological developments and advances in photochemistry and genetic engineering have boosted all aspects of resolution, readout and throughput, rendering ALM ideally suited for biological space research. While various microscopy-based studies have addressed cellular response to space-related environmental stressors, biological endpoints have typically been determined only after the mission, leaving an experimental gap that is prone to bias results. An on-board, real-time microscopical monitoring device can bridge this gap. Breadboards and even fully operational microscope setups have been conceived, but they need to be rendered more compact and versatile. Most importantly, they must allow addressing the impact of gravity, or the lack thereof, on physiologically relevant biological systems in space and in ground-based simulations. In order to delineate the essential functionalities for such a system, we have reviewed the pending questions in space science, the relevant biological model systems, and the state-of-the art in ALM. Based on a rigorous trade-off, in which we recognize the relevance of multi-cellular systems and the cellular microenvironment, we propose a compact, but flexible concept for space-related cell biological research that is based on light sheet microscopy.

  16. NEW - DOE O 333.1, Administering Work Force Discipline

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    The order provides requirements and responsibilities for administering work force discipline and corrective actions.

  17. Simultaneous orientation and thickness mapping in transmission electron microscopy

    SciTech Connect (OSTI)

    Tyutyunnikov, Dmitry; Özdöl, V. Burak; Koch, Christoph T.

    2014-12-04

    In this paper we introduce an approach for simultaneous thickness and orientation mapping of crystalline samples by means of transmission electron microscopy. We show that local thickness and orientation values can be extracted from experimental dark-field (DF) image data acquired at different specimen tilts. The method has been implemented to automatically acquire the necessary data and then map thickness and crystal orientation for a given region of interest. We have applied this technique to a specimen prepared from a commercial semiconductor device, containing multiple 22 nm technology transistor structures. The performance and limitations of our method are discussed and compared to those of other techniques available.

  18. X-Ray Microscopy Capabilities | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Microscopy Capabilities The Hard X-Ray Nanoprobe (HXN) facility provides scanning fluorescence, scanning diffraction, and full-field transmission and tomographic imaging capabilities with a spatial resolution of 30 nm over a spectral range of 6-12 keV. Modes of Operation Full-Field Transmission Imaging and Nanotomography X-ray transmission imaging uses both the absorption and phase shift of the X-ray beam by the sample as contrast mechanisms. Absorption contrast is used to map the sample

  19. Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Seo, Minah; Yamaguchi, Hisato; Mohite, Aditya D.; Boubanga-Tombet, Stephane; Blancon, Jean-Christophe; Najmaei, Sina; Ajayan, Pulickel M.; Lou, Jun; Taylor, Antoinette J.; Prasankumar, Rohit P.

    2016-02-15

    We performed ultrafast optical microscopy on single flakes of atomically thin CVD-grown molybdenum disulfide, using non-degenerate femtosecond pump-probe spectroscopy to excite and probe carriers above and below the indirect and direct band gaps. These measurements reveal the influence of layer thickness on carrier dynamics when probing near the band gap. Furthermore, fluence-dependent measurements indicate that carrier relaxation is primarily influenced by surface-related defect and trap states after above-bandgap photoexcitation. Furthermore, the ability to probe femtosecond carrier dynamics in individual flakes can thus give much insight into light-matter interactions in these two-dimensional nanosystems.

  20. Magnetic imaging with full-field soft X-ray microscopies (Journal...

    Office of Scientific and Technical Information (OSTI)

    X-ray microscopies Citation Details In-Document Search Title: Magnetic imaging with full-field soft X-ray microscopies You are accessing a document from the Department of ...

  1. New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution New Zone Plate for Soft X-Ray Microscopy at 15-nm Spatial Resolution Print Wednesday, 31 August 2005 00:00 ...

  2. Microbial Cell Imaging

    SciTech Connect (OSTI)

    Doktycz, Mitchel John; Sullivan, Claretta; Mortensen, Ninell P; Allison, David P

    2011-01-01

    Atomic force microscopy (AFM) is finding increasing application in a variety of fields including microbiology. Until the emergence of AFM, techniques for ivnestigating processes in single microbes were limited. From a biologist's perspective, the fact that AFM can be used to generate high-resolution images in buffers or media is its most appealing feature as live-cell imaging can be pursued. Imaging living cells by AFM allows dynamic biological events to be studied, at the nanoscale, in real time. Few areas of biological research have as much to gain as microbiology from the application of AFM. Whereas the scale of microbes places them near the limit of resolution for light microscopy. AFM is well suited for the study of structures on the order of a micron or less. Although electron microscopy techniques have been the standard for high-resolution imaging of microbes, AFM is quickly gaining favor for several reasons. First, fixatives that impair biological activity are not required. Second, AFM is capable of detecting forces in the pN range, and precise control of the force applied to the cantilever can be maintained. This combination facilitates the evaluation of physical characteristics of microbes. Third, rather than yielding the composite, statistical average of cell populations, as is the case with many biochemical assays, the behavior of single cells can be monitored. Despite the potential of AFM in microbiology, there are several limitations that must be considered. For example, the time required to record an image allows for the study of gross events such as cell division or membrane degradation from an antibiotic but precludes the evaluation of biological reactions and events that happen in just fractions of a second. Additionally, the AFM is a topographical tool and is restricted to imaging surfaces. Therefore, it cannot be used to look inside cells as with opticla and transmission electron microscopes. other practical considerations are the limitation on

  3. Towards Understanding the Mechanism of PETN Coarsening

    SciTech Connect (OSTI)

    Qiu, R; Overturf, G; Gee, R; Burnham, A; Weeks, B; De Yoreo, J

    2005-03-23

    The long-term goal is to determine the mechanism of PETN crystallization and coarsening at the solid-vapor interface and to quantify the thermodynamic and kinetic parameters that control those processes. We achieve this goal by investigating the surface evolution of synthetic PETN single crystals using in situ atomic force microscopy (AFM) at various temperatures.

  4. Work Force Retention Work Group Charter | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Force Retention Work Group Charter Work Force Retention Work Group Charter The Work force Retention Work Group is established to support the Department's critical focus on maintaining a high-performing work force at a time when a significant number of the workers needed to support DOE's national security mission are reaching retirement age. Work Force Retention Work Group Charter (86.92 KB) More Documents & Publications Workforce Retention Work Group Status Overview - September 2012 Training

  5. Air Force Enhanced Use Lease | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Enhanced Use Lease Air Force Enhanced Use Lease Presentation-given at the Fall 2012 Federal Utility Partnership Working Group (FUPWG) meeting-discusses the U.S. Air Force's (USAF's) enhanced use leases (EULs), including energy EULs and EUL goals. Download the Air Force Enhanced Use Lease presentation. (594.58 KB) More Documents & Publications Air Force Renewable Energy Programs Assessment of Small Modular Reactor Suitability for Use On or Near Air Force Space Command Installations SAND

  6. Federal Smart Grid Task Force | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Federal Smart Grid Task Force Federal Smart Grid Task Force Task Force Background The Federal Smart Grid Task Force was established under Title XIII of the Energy Independence and Security Act of 2007 (EISA) and includes experts from eleven Federal agencies. The Department of Energy is represented by the Office of Electricity Delivery and Energy Reliability which is the Task Force lead, as well as the Office of Energy Efficiency and Renewable Energy and the National Energy Technology Laboratory.

  7. Interagency Energy Management Task Force Members | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Interagency Energy Management Task Force Members Interagency Energy Management Task Force Members The Interagency Energy Management Task Force is led by the Federal Energy Management Program director. Members include energy and sustainability managers from federal agencies. Task Force Executive Director Dr. Timothy Unruh U.S. Department of Energy 202-586-5772 Task Force Members Organization Primary Contact Alternate Contact General Services Administration Mark Ewing Karren Curran National

  8. Electron microscopy study of direct laser deposited IN718

    SciTech Connect (OSTI)

    Ding, R.G.; Huang, Z.W.; Li, H.Y.; Mitchell, I.; Baxter, G.; Bowen, P.

    2015-08-15

    The microstructure of direct laser deposited (DLD) IN718 has been investigated in detail using scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The results confirm that the dendrite core microstructure can be linked to the cooling rate experienced during the deposition. A ~ 100 μm wide δ partially dissolved region in the IN718 substrate was observed close to the substrate/deposit boundary. In the deposited IN718, γ/Laves eutectic constituent is the predominant minor microconstituent. Irregular and regular (small) (Nb,Ti)C carbides and a mixture of the carbides and Laves were observed. Most M{sub 3}B{sub 2} borides were nucleated around a (Nb,Ti)C carbide. Needles of δ phase precipitated from the Laves phase were also observed. A complex constituent (of Laves, δ, α-Cr, γ″, and γ matrix) is reported in IN718 for the first time. The formation of α-Cr particles could be related to Cr rejection during the formation and growth of Cr-depleted δ phase. - Highlights: • Secondary phases in IN718 deposits were identified using electron diffraction and EDS. • MC, M{sub 3}B{sub 2}, γ/Laves eutectic and γ/NbC/Laves eutectic were observed. • Needle-like δ phases were precipitated from the Laves phase. • A complex constituent (Laves, δ, α-Cr, γ″ and γ) was reported for the first time.

  9. Coupling EELS/EFTEM Imaging with Environmental Fluid Cell Microscopy

    SciTech Connect (OSTI)

    Unocic, Raymond R; Baggetto, Loic; Veith, Gabriel M; Dudney, Nancy J; More, Karren Leslie

    2012-01-01

    Insight into dynamically evolving electrochemical reactions and mechanisms encountered in electrical energy storage (EES) and conversion technologies (batteries, fuel cells, and supercapacitors), materials science (corrosion and oxidation), and materials synthesis (electrodeposition) remains limited due to the present lack of in situ high-resolution characterization methodologies. Electrochemical fluid cell microscopy is an emerging in-situ method that allows for the direct, real-time imaging of electrochemical processes within a fluid environment. This technique is facilitated by the use of MEMS-based biasing microchip platforms that serve the purpose of sealing the highly volatile electrolyte between two electron transparent SiNx membranes and interfacing electrodes to an external potentiostat for controlled nanoscale electrochemislly experiments [!]. In order to elucidate both stmctural and chemical changes during such in situ electrochemical experiments, it is impmtant to first improve upon the spatial resolution by utilizing energy-filtered transmission electron microscopy (EFTEM) (to minimize chromatic aben ation), then to detennine the chemical changes via electron energy loss spectroscopy (EELS). This presents a formidable challenge since the overall thickness through which electrons are scattered through the multiple layers of the cell can be on the order of hundreds of nanometers to microns, scattering through which has the deleterious effect of degrading image resolution and decreasing signal-to noise for spectroscopy [2].

  10. Collaborative Computational Project for Electron cryo-Microscopy

    SciTech Connect (OSTI)

    Wood, Chris; Burnley, Tom [Science and Technology Facilities Council, Research Complex at Harwell, Didcot OX11 0FA (United Kingdom); Patwardhan, Ardan [European Molecular Biology Laboratory, Wellcome Trust Genome Campus, Hinxton, Cambridge CB10 1SD (United Kingdom); Scheres, Sjors [MRC Laboratory of Molecular Biology, Francis Crick Avenue, Cambridge Biomedical Campus, Cambridge CB2 0QH (United Kingdom); Topf, Maya [University of London, Malet Street, London WC1E 7HX (United Kingdom); Roseman, Alan [University of Manchester, Oxford Road, Manchester M13 9PT (United Kingdom); Winn, Martyn, E-mail: martyn.winn@stfc.ac.uk [Science and Technology Facilities Council, Daresbury Laboratory, Warrington WA4 4AD (United Kingdom); Science and Technology Facilities Council, Research Complex at Harwell, Didcot OX11 0FA (United Kingdom)

    2015-01-01

    The Collaborative Computational Project for Electron cryo-Microscopy (CCP-EM) is a new initiative for the structural biology community, following the success of CCP4 for macromolecular crystallography. Progress in supporting the users and developers of cryoEM software is reported. The Collaborative Computational Project for Electron cryo-Microscopy (CCP-EM) has recently been established. The aims of the project are threefold: to build a coherent cryoEM community which will provide support for individual scientists and will act as a focal point for liaising with other communities, to support practising scientists in their use of cryoEM software and finally to support software developers in producing and disseminating robust and user-friendly programs. The project is closely modelled on CCP4 for macromolecular crystallography, and areas of common interest such as model fitting, underlying software libraries and tools for building program packages are being exploited. Nevertheless, cryoEM includes a number of techniques covering a large range of resolutions and a distinct project is required. In this article, progress so far is reported and future plans are discussed.

  11. Frontiers of in situ electron microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by in this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.

  12. Magnetic properties and transmission electron microscopy studies of Ni nanoparticles encapsulated in carbon nanocages and carbon nanotubes

    SciTech Connect (OSTI)

    He Chunnian; Zhao Naiqin Shi Chunsheng; Li Jiajun; Li Haipeng

    2008-08-04

    Three types of carbon nanomaterials, including bamboo-shaped carbon nanotubes with Ni encapsulated and hollow and Ni catalytic particles filled carbon nanocages, have been prepared by methane catalytic decomposition at a relatively low temperature. Transmission electron microscopy observations showed that fascinating fullerene-like Ni-C (graphitic) core-shell nanostructures predominated. Detailed examination of high-resolution transmission electron microscopy showed that the walls of bamboo-shaped carbon nanotubes with quasi-cone catalytic particles encapsulated consisted of oblique graphene planes with respect to the tube axis. The Ni particles encapsulated in the carbon nanocages were larger than that encapsulated in carbon nanotubes, but the diameters of the cores of hollow carbon nanocages were less than that of Ni particles encapsulated in carbon nanotubes, suggesting that the sizes of catalyst particles played an important role during carbon nanomaterial growth. The magnetic properties of the carbon nanomaterials were measured, which showed relatively large coercive force (H{sub c} = 138.4 O{sub e}) and good ferromagnetism (M{sub r}/M{sub s} = 0.325)

  13. Friction forces on atoms after acceleration

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Intravaia, Francesco; Mkrtchian, Vanik E.; Buhmann, Stefan Yoshi; Scheel, Stefan; Dalvit, Diego A. R.; Henkel, Carsten

    2015-05-12

    The aim of this study is to revisit the calculation of atom–surface quantum friction in the quantum field theory formulation put forward by Barton (2010 New J. Phys. 12 113045). We show that the power dissipated into field excitations and the associated friction force depend on how the atom is boosted from being initially at rest to a configuration in which it is moving at constant velocity (v) parallel to the planar interface. In addition, we point out that there is a subtle cancellation between the one-photon and part of the two-photon dissipating power, resulting in a leading order contributionmore » to the frictional power which goes as v4. These results are also confirmed by an alternative calculation of the average radiation force, which scales as v3.« less

  14. Friction forces on atoms after acceleration

    SciTech Connect (OSTI)

    Intravaia, Francesco; Mkrtchian, Vanik E.; Buhmann, Stefan Yoshi; Scheel, Stefan; Dalvit, Diego A. R.; Henkel, Carsten

    2015-05-12

    The aim of this study is to revisit the calculation of atom–surface quantum friction in the quantum field theory formulation put forward by Barton (2010 New J. Phys. 12 113045). We show that the power dissipated into field excitations and the associated friction force depend on how the atom is boosted from being initially at rest to a configuration in which it is moving at constant velocity (v) parallel to the planar interface. In addition, we point out that there is a subtle cancellation between the one-photon and part of the two-photon dissipating power, resulting in a leading order contribution to the frictional power which goes as v4. These results are also confirmed by an alternative calculation of the average radiation force, which scales as v3.

  15. Illinois task force on global climate change

    SciTech Connect (OSTI)

    Griffin, B.S.

    1996-12-31

    The purpose of this report is to document progress in the areas of national policy development, emissions reduction, research and education, and adaptation, and to identify specific actions that will be undertaken to implement the Illinois state action plan. The task force has been tracking national and international climate change policy, and helping shape national policy agenda. Identification and implementation of cost-effective mitigation measures has been performed for emissions reduction. In the area of research and education, the task force is developing the capacity to measure climate change indicators, maintaining and enhancing Illinois relevant research, and strengthening climate change education. Activities relevant to adaptation to new policy include strengthening water laws and planning for adaptation. 6 figs., 4 tabs.

  16. protective forces | National Nuclear Security Administration

    National Nuclear Security Administration (NNSA)

    protective forces Design Basis Threat NNSA has taken aggressive action to improve the security of its nuclear weapons material (often referred to as special nuclear material, or SNM) and nuclear weapons in its custody. One major challenge has been, and remains, ensuring that SNM is well protected, while at the same time,... Information Security Information security deals with requirements for the protection and control of information and matter required to be classified or controlled by

  17. CASL - Lift Forces in Bubbly Flows

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lift Forces in Bubbly Flows The dynamics of two-phase (gas/liquid) bubbly flows are complex: bubbles deform and disperse; large latent heats and heat capacity differentials influence local boiling; and relatively small changes in heated surface temperatures yield order of magnitude changes in boiling complexity. Because the local void volume has a direct feedback effect on reactor neutron flux and fuel rod power production, prediction of local boiling rates and bulk boiling effects in nuclear

  18. Departmental Response: SEAB Task Force Recommendations on

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Departmental Response: SEAB Task Force Recommendations on Technology Development for Environmental Management Introduction In May 2014, Energy Secretary Ernest Moniz charged the Secretary of Energy Advisory Board (SEAB) to provide advice as to how the United States (U.S.) Department of Energy (DOE) could more effectively ensure the development of technology necessary for the Office of Environmental Management (EM) to complete its mission, cleanup of legacy waste sites. The SEAB formed a Task

  19. Center for Nanophase Materials Sciences (CNMS) - Imaging Functionality...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Ambient Scanning Probe Microscopy Magnetic Force Microscopy Electrical Force Microscopy Kelvin Probe Force Microscopy Conductive Atomic Force Microscopy Heated tip (blueDrive)...

  20. Squeeze bottle apparatus with force multiplying pistons

    DOE Patents [OSTI]

    Moss, Owen R.; Gordon, Norman R.; DeFord, Henry S.; Eschbach, Eugene A.

    1994-01-01

    The present invention comprises a spray bottle in which the pressure resulting from the gripping force applied by the user is amplified and this increased pressure used in generating a spray such as an aerosol or fluid stream. In its preferred embodiment, the invention includes a high pressure chamber and a corresponding piston which is operative for driving fluid out of this chamber at high pressure through a spray nozzle and a low pressure chamber, and a corresponding piston which is acted upon by the hydraulic pressure within the bottle resulting from the gripping force. The low pressure chamber and piston are of larger size than the high pressure chamber and piston. The pistons are rigidly connected so that the force created by the pressure acting on the piston in the low pressure chamber is transmitted to the piston in the high pressure chamber where it is applied over a more limited area, thereby generating greater hydraulic pressure for use in forming the spray.

  1. Confocal volume in laser Raman microscopy depth profiling

    SciTech Connect (OSTI)

    Maruyama, Yutaka; Kanematsu, Wataru

    2011-11-15

    To clarify the degradation of confocality in laser Raman microscopy depth profiling (optical sectioning) and the influence of pinhole filtering on it, we investigate the confocal volume in detail based on Gaussian beam optics and scalar wave optics. Theoretical depth profiles of a homogeneous transparent sample for four different pinhole sizes, which are computed using the measured incident beam waist radius w{sub 0} and only a few optical system specific parameters such as a numerical aperture (NA) and a focal length, show a good agreement with the corresponding measured depth profiles. The computed confocal volume demonstrates that the pinhole size affects the actual probe depth as well as the axial resolution and the total intensity loss.

  2. Reactor cell assembly for use in spectroscopy and microscopy applications

    SciTech Connect (OSTI)

    Grindstaff, Quirinus; Stowe, Ashley Clinton; Smyrl, Norm; Powell, Louis; McLane, Sam

    2015-08-04

    The present disclosure provides a reactor cell assembly that utilizes a novel design and that is wholly or partially manufactured from Aluminum, such that reactions involving Hydrogen, for example, including solid-gas reactions and thermal decomposition reactions, are not affected by any degree of Hydrogen outgassing. This reactor cell assembly can be utilized in a wide range of optical and laser spectroscopy applications, as well as optical microscopy applications, including high-temperature and high-pressure applications. The result is that the elucidation of the role of Hydrogen in the reactions studied can be achieved. Various window assemblies can be utilized, such that high temperatures and high pressures can be accommodated and the signals obtained can be optimized.

  3. Time resolved electron microscopy for in situ experiments

    SciTech Connect (OSTI)

    Campbell, Geoffrey H. McKeown, Joseph T.; Santala, Melissa K.

    2014-12-15

    Transmission electron microscopy has functioned for decades as a platform for in situ observation of materials and processes with high spatial resolution. Yet, the dynamics often remain elusive, as they unfold too fast to discern at these small spatial scales under traditional imaging conditions. Simply shortening the exposure time in hopes of capturing the action has limitations, as the number of electrons will eventually be reduced to the point where noise overtakes the signal in the image. Pulsed electron sources with high instantaneous current have successfully shortened exposure times (thus increasing the temporal resolution) by about six orders of magnitude over conventional sources while providing the necessary signal-to-noise ratio for dynamic imaging. We describe here the development of this new class of microscope and the principles of its operation, with examples of its application to problems in materials science.

  4. System and method for compressive scanning electron microscopy

    DOE Patents [OSTI]

    Reed, Bryan W

    2015-01-13

    A scanning transmission electron microscopy (STEM) system is disclosed. The system may make use of an electron beam scanning system configured to generate a plurality of electron beam scans over substantially an entire sample, with each scan varying in electron-illumination intensity over a course of the scan. A signal acquisition system may be used for obtaining at least one of an image, a diffraction pattern, or a spectrum from the scans, the image, diffraction pattern, or spectrum representing only information from at least one of a select subplurality or linear combination of all pixel locations comprising the image. A dataset may be produced from the information. A subsystem may be used for mathematically analyzing the dataset to predict actual information that would have been produced by each pixel location of the image.

  5. Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series

    SciTech Connect (OSTI)

    Dahmen, Tim; Baudoin, Jean-Pierre G; Lupini, Andrew R; Kubel, Christian; Slusallek, Phillip; De Jonge, Niels

    2014-01-01

    In this study, a combined tilt- and focal series is proposed as a new recording scheme for high-angle annular dark-field scanning transmission electron microscopy (STEM) tomography. Three-dimensional (3D) data were acquired by mechanically tilting the specimen, and recording a through-focal series at each tilt direction. The sample was a whole-mount macrophage cell with embedded gold nanoparticles. The tilt focal algebraic reconstruction technique (TF-ART) is introduced as a new algorithm to reconstruct tomograms from such combined tilt- and focal series. The feasibility of TF-ART was demonstrated by 3D reconstruction of the experimental 3D data. The results were compared with a conventional STEM tilt series of a similar sample. The combined tilt- and focal series led to smaller missing wedge artifacts, and a higher axial resolution than obtained for the STEM tilt series, thus improving on one of the main issues of tilt series-based electron tomography.

  6. Integrated fiducial sample mount and software for correlated microscopy

    SciTech Connect (OSTI)

    Timothy R McJunkin; Jill R. Scott; Tammy L. Trowbridge; Karen E. Wright

    2014-02-01

    A novel design sample mount with integrated fiducials and software for assisting operators in easily and efficiently locating points of interest established in previous analytical sessions is described. The sample holder and software were evaluated with experiments to demonstrate the utility and ease of finding the same points of interest in two different microscopy instruments. Also, numerical analysis of expected errors in determining the same position with errors unbiased by a human operator was performed. Based on the results, issues related to acquiring reproducibility and best practices for using the sample mount and software were identified. Overall, the sample mount methodology allows data to be efficiently and easily collected on different instruments for the same sample location.

  7. Advanced analytical electron microscopy for alkali-ion batteries

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Qian, Danna; Ma, Cheng; Meng, Ying Shirley; More, Karren; Chi, Miaofang

    2015-01-01

    Lithium-ion batteries are a leading candidate for electric vehicle and smart grid applications. However, further optimizations of the energy/power density, coulombic efficiency and cycle life are still needed, and this requires a thorough understanding of the dynamic evolution of each component and their synergistic behaviors during battery operation. With the capability of resolving the structure and chemistry at an atomic resolution, advanced analytical transmission electron microscopy (AEM) is an ideal technique for this task. The present review paper focuses on recent contributions of this important technique to the fundamental understanding of the electrochemical processes of battery materials. A detailed reviewmore » of both static (ex situ) and real-time (in situ) studies will be given, and issues that still need to be addressed will be discussed.« less

  8. Calibration of fluorescence resonance energy transfer in microscopy

    DOE Patents [OSTI]

    Youvan, Dougalas C.; Silva, Christopher M.; Bylina, Edward J.; Coleman, William J.; Dilworth, Michael R.; Yang, Mary M.

    2003-12-09

    Imaging hardware, software, calibrants, and methods are provided to visualize and quantitate the amount of Fluorescence Resonance Energy Transfer (FRET) occurring between donor and acceptor molecules in epifluorescence microscopy. The MicroFRET system compensates for overlap among donor, acceptor, and FRET spectra using well characterized fluorescent beads as standards in conjunction with radiometrically calibrated image processing techniques. The MicroFRET system also provides precisely machined epifluorescence cubes to maintain proper image registration as the sample is illuminated at the donor and acceptor excitation wavelengths. Algorithms are described that pseudocolor the image to display pixels exhibiting radiometrically-corrected fluorescence emission from the donor (blue), the acceptor (green) and FRET (red). The method is demonstrated on samples exhibiting FRET between genetically engineered derivatives of the Green Fluorescent Protein (GFP) bound to the surface of Ni chelating beads by histidine-tags.

  9. Calibration of fluorescence resonance energy transfer in microscopy

    DOE Patents [OSTI]

    Youvan, Douglas C.; Silva, Christopher M.; Bylina, Edward J.; Coleman, William J.; Dilworth, Michael R.; Yang, Mary M.

    2002-09-24

    Imaging hardware, software, calibrants, and methods are provided to visualize and quantitate the amount of Fluorescence Resonance Energy Transfer (FRET) occurring between donor and acceptor molecules in epifluorescence microscopy. The MicroFRET system compensates for overlap among donor, acceptor, and FRET spectra using well characterized fluorescent beads as standards in conjunction with radiometrically calibrated image processing techniques. The MicroFRET system also provides precisely machined epifluorescence cubes to maintain proper image registration as the sample is illuminated at the donor and acceptor excitation wavelengths. Algorithms are described that pseudocolor the image to display pixels exhibiting radiometrically-corrected fluorescence emission from the donor (blue), the acceptor (green) and FRET (red). The method is demonstrated on samples exhibiting FRET between genetically engineered derivatives of the Green Fluorescent Protein (GFP) bound to the surface of Ni chelating beads by histidine-tags.

  10. Simultaneous orientation and thickness mapping in transmission electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Tyutyunnikov, Dmitry; Özdöl, V. Burak; Koch, Christoph T.

    2014-12-04

    In this paper we introduce an approach for simultaneous thickness and orientation mapping of crystalline samples by means of transmission electron microscopy. We show that local thickness and orientation values can be extracted from experimental dark-field (DF) image data acquired at different specimen tilts. The method has been implemented to automatically acquire the necessary data and then map thickness and crystal orientation for a given region of interest. We have applied this technique to a specimen prepared from a commercial semiconductor device, containing multiple 22 nm technology transistor structures. The performance and limitations of our method are discussed and comparedmore » to those of other techniques available.« less

  11. Advanced analytical electron microscopy for alkali-ion batteries

    SciTech Connect (OSTI)

    Qian, Danna; Ma, Cheng; Meng, Ying Shirley; More, Karren; Chi, Miaofang

    2015-01-01

    Lithium-ion batteries are a leading candidate for electric vehicle and smart grid applications. However, further optimizations of the energy/power density, coulombic efficiency and cycle life are still needed, and this requires a thorough understanding of the dynamic evolution of each component and their synergistic behaviors during battery operation. With the capability of resolving the structure and chemistry at an atomic resolution, advanced analytical transmission electron microscopy (AEM) is an ideal technique for this task. The present review paper focuses on recent contributions of this important technique to the fundamental understanding of the electrochemical processes of battery materials. A detailed review of both static (ex situ) and real-time (in situ) studies will be given, and issues that still need to be addressed will be discussed.

  12. NMR microscopy of heavy metal absorption in calcium alginate beads

    SciTech Connect (OSTI)

    Nestle, N.; Kimmich, R.

    1996-01-01

    In recent years, heavy metal uptake by biopolymer gels, such as Cal-Alginate or chitosan, has been studied by various methods. This is of interest because such materials might be an alternative to synthetical ion-exchange resins in the treatment of industrial waste waters. Most of the work done in this field consisted of studies of equilibrium absorption of different heavy metal ions with dependence on various experimental parameters. In some publications, the kinetics of absorption were studied, too. However, no experiments on the spatial distribution of heavy metals during the absorption process are known to us. Using Cu as an example, it is demonstrated in this article that NMR microscopy is an appropriate tool for such studies. By the method presented here, it is possible to monitor the spatial distribution of heavy metal ions with a time resolution of about 5 min and a spatial resolution of 100 {mu}m or even better. 14 refs., 10 figs.

  13. Cryo diffraction microscopy: Ice conditions and finite supports

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Miao, H.; Downing, K.; Huang, X.; Kirz, J.; Marchesini, S.; Nelson, J.; Shapiro, D.; Steinbrener, J.; Stewart, A.; Jacobsen, C.

    2009-09-01

    Using a signal-to-noise ratio estimation based on correlations between multiple simulated images, we compare the dose efficiency of two soft x-ray imaging systems: incoherent brightfield imaging using zone plate optics in a transmission x-ray microscope (TXM), and x-ray diffraction microscopy (XDM) where an image is reconstructed from the far-field coherent diffraction pattern. In XDM one must computationally phase weak diffraction signals; in TXM one suffers signal losses due to the finite numerical aperture and efficiency of the optics. In simulations with objects representing isolated cells such as yeast, we find that XDM has the potential for delivering equivalent resolution imagesmore » using fewer photons. This can be an important advantage for studying radiation-sensitive biological and soft matter specimens.« less

  14. Investigation of forced and isothermal chemical vapor infiltrated SiC/SiC ceramic matrix composites. Final report

    SciTech Connect (OSTI)

    Sankar, J.; Kelkar, A.D.; Vaidyanathan, R.

    1993-09-01

    Mechanical properties of two different layups for each of the forced CVI (41 specimens) and isothermal CVI (36 specimens) materials were investigated in air at room temperature (RT), 1000C, and at room temperature after thermal shock (RT/TS) and exposure to oxidation (RT/OX). The FCVI specimens had a nominal interfacial coating thickness of 0.3 {mu}m of pyrolytic carbon, while CVI specimens had a coating thickness of 0.1 {mu}m. Effect of reinforcement and interfacial bond on mechanical properties of composite were investigated. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were employed to analyze the fiber-matrix interface and the toughening mechanisms in this ceramic composite system.

  15. EUV Dark-Field Microscopy for Defect Inspection

    SciTech Connect (OSTI)

    Juschkin, L.; Maryasov, A.; Herbert, S.; Aretz, A.; Bergmann, K.; Lebert, R.

    2011-09-09

    An actinic EUV microscope for defect detection on mask blanks for operation in dark field using a table-top discharge-produced plasma source has been developed. Several test structures (pits and bumps) on multilayer mirrors were investigated by our Schwarzschild objective-based EUV microscope at 13.5-nm wavelength and then characterized with an atomic force microscope. Possible defect-detection limits with large field of view and moderate magnification are discussed in terms of required irradiation dose and system performance.

  16. In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry

    SciTech Connect (OSTI)

    Graetz J.; Meng, Y.S.; McGilvray, T.; Yang, M.-C.; Gostovic, D.; Wang, F.; Zeng, D.; Zhu, Y.

    2011-10-31

    Oxides and their tailored structures are at the heart of electrochemical energy storage technologies and advances in understanding and controlling the dynamic behaviors in the complex oxides, particularly at the interfaces, during electrochemical processes will catalyze creative design concepts for new materials with enhanced and better-understood properties. Such knowledge is not accessible without new analytical tools. New innovative experimental techniques are needed for understanding the chemistry and structure of the bulk and interfaces, more importantly how they change with electrochemical processes in situ. Analytical Transmission Electron Microscopy (TEM) is used extensively to study electrode materials ex situ and is one of the most powerful tools to obtain structural, morphological, and compositional information at nanometer scale by combining imaging, diffraction and spectroscopy, e.g., EDS (energy dispersive X-ray spectrometry) and Electron Energy Loss Spectrometry (EELS). Determining the composition/structure evolution upon electrochemical cycling at the bulk and interfaces can be addressed by new electron microscopy technique with which one can observe, at the nanometer scale and in situ, the dynamic phenomena in the electrode materials. In electrochemical systems, for instance in a lithium ion battery (LIB), materials operate under conditions that are far from equilibrium, so that the materials studied ex situ may not capture the processes that occur in situ in a working battery. In situ electrochemical operation in the ultra-high vacuum column of a TEM has been pursued by two major strategies. In one strategy, a 'nano-battery' can be fabricated from an all-solid-state thin film battery using a focused ion beam (FIB). The electrolyte is either polymer based or ceramic based without any liquid component. As shown in Fig. 1a, the interfaces between the active electrode material/electrolyte can be clearly observed with TEM imaging, in contrast to the

  17. On photo-expansion and microlens formation in (GeS{sub 2}){sub 0.74}(Sb{sub 2}S{sub 3}){sub 0.26} chalcogenide glass

    SciTech Connect (OSTI)

    Knotek, P.; Tichy, L.

    2012-12-15

    Graphical abstract: Display Omitted Highlights: ? Photo-expansion induced by sub-band-gap photons in GeSbS glass. ? One-step microlens formation. ? The topography of the microlenses detected by AFM and DHM. ? The good mechanical characteristics of the microlenses were obtained. ? Local light-induced overheating of the glass. -- Abstract: Photo-expansion of the bulk of (GeS{sub 2}){sub 0.74}(Sb{sub 2}S{sub 3}){sub 0.26} glass induced by sub-gap photons is studied employing specifically atomic force microscopy (AFM) namely an atomic force acoustic microscopy (AFAM) and a force spectroscopy and digital holographic microscopy. The results are discussed with respect to the possible role of light induced overheating in the process of photo-expansion.

  18. Environmental security: Concepts and air force implementation

    SciTech Connect (OSTI)

    Walewski, J.A.

    1995-12-01

    With the end of the Cold War the Department of Defense (DoD) has been reorganized to establish the position of Deputy Under Secretary of Defense for Environmental Security. As a result, the definition of national security has been broadened to include the environment. Environment and protection of the interrelated resources are seen as vital components to the health and welfare of the United States. National security is dependent on environmental security. This paper introduces the role of environmental security as a component of current national security strategy; reviews DoD and the military services role in the domestic legacy of environmental impacts created by the cold war; details the status of current programs and methodologies used to improve environmental performance, compliance with environmental laws, and stewardship activities. Implementation will be demonstrated using Air Force policy, programs and activities underway, and a detailed explanation of Air Force environmental goals and objectives will be highlighted. Lessons learned to date will be covered in addition to future alternative strategies. Military readiness however does not preclude environmental stewardship. Many military lands have become virtual sanctuaries since years of restricted access and activity created islands of diverse ecosystems. Recent survey and inventory work on DoD lands have found some of the most pristine tracts remaining in the country. Consolidation of mission activities through base closure an realignment, and increasing weapon system sophistication, adds additional challenges to comply with environmental laws and regulation. This paper will define these unique environmental challenges, and discuss the methodologies used by the Air Force to fulfill its environmental stewardship role.

  19. Stability at low symmetric force levels

    SciTech Connect (OSTI)

    Canavan, G.H.

    1997-09-01

    At low force levels stability indices depend primarily on the number of vulnerable missiles and the number of weapons on them. The index reduces to a product of the number of vulnerable missiles and the differences between normalized second and first strikes by vulnerable weapons. As the number of weapons per vulnerable missile decreases, the index rapidly approaches stability. Further reductions in vulnerable and survivable missiles and weapons do not affect stability, although they do reduce first and second strikes. Modest weapon reconstitution degrades stability significantly.

  20. Color force saturation in nuclear chromodynamics

    SciTech Connect (OSTI)

    Sivers, D.

    1985-01-01

    A simple representation of the Q anti QQ anti Q Green's Function in the strong coupling quenched approximation to lattice QCD is used to illustrate the nature of color force saturation in chromodynamics. The example shows that configuration mixing allows a binding energy of a few MeV in a Q anti QQ anti Q ''molecule'' formed from mesons with mass 1 GeV. In lattice QCD, configuration mixing can be calculated on the same footing with glueball exchange effects by measuring the appropriate operators in a Monte Carlo simulation. 3 refs., 5 figs.

  1. Coke cake behavior under compressive forces

    SciTech Connect (OSTI)

    Watakabe, S.; Takeda, T.; Itaya, H.; Suginobe, H.

    1997-12-31

    The deformation of the coke cake and load on the side wall during pushing were studied using an electric furnace equipped with a movable wall. Coke cake was found to deform in three stages under compressive forces. The coke cake was shortened in the pushing direction in the cake deformation stage, and load was generated on the side walls in the high wall load stage. Secondary cracks in the coke cake were found to prevent load transmission on the wall. The maximum load transmission rate was controlled by adjusting the maximum fluidity and mean reflectance of the blended coal.

  2. Development of Integrated ASR Model Forcing Data and Their Application...

    Office of Scientific and Technical Information (OSTI)

    ARM model forcing data, and (2) used the ARM forcing data to identify systematic biases in clouds and radiation in the CAM5 and design new physical parameterizations to improve it. ...

  3. Radiative Forcing of Climate Change (Book) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    SciTech Connect Search Results Book: Radiative Forcing of Climate Change Citation Details In-Document Search Title: Radiative Forcing of Climate Change Chapter 6 of the IPCC Third ...

  4. Government and Industry a Force for Collaboration at the Energy...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    A Force for Collaboration at the Energy Roadmap Update Workshop Sept. 16, 2009 Energy ... forces at a workshop to help update the Roadmap to Secure Control Systems in the Energy ...

  5. ARM - Midlatitude Continental Convective Clouds - Single Column Model Forcing (xie-scm_forcing)

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Xie, Shaocheng; McCoy, Renata; Zhang, Yunyan

    2012-10-25

    The constrained variational objective analysis approach described in Zhang and Lin [1997] and Zhang et al. [2001]was used to derive the large-scale single-column/cloud resolving model forcing and evaluation data set from the observational data collected during Midlatitude Continental Convective Clouds Experiment (MC3E), which was conducted during April to June 2011 near the ARM Southern Great Plains (SGP) site. The analysis data cover the period from 00Z 22 April - 21Z 6 June 2011. The forcing data represent an average over the 3 different analysis domains centered at central facility with a diameter of 300 km (standard SGP forcing domain size), 150 km and 75 km, as shown in Figure 1. This is to support modeling studies on various-scale convective systems.

  6. Laser interferometry force-feedback sensor for an interfacial force microscope

    DOE Patents [OSTI]

    Houston, Jack E.; Smith, William L.

    2004-04-13

    A scanning force microscope is provided with a force-feedback sensor to increase sensitivity and stability in determining interfacial forces between a probe and a sample. The sensor utilizes an interferometry technique that uses a collimated light beam directed onto a deflecting member, comprising a common plate suspended above capacitor electrodes situated on a substrate forming an interference cavity with a probe on the side of the common plate opposite the side suspended above capacitor electrodes. The probe interacts with the surface of the sample and the intensity of the reflected beam is measured and used to determine the change in displacement of the probe to the sample and to control the probe distance relative to the surface of the sample.

  7. Before the House Armed Services Subcommittee on Strategic Forces |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy Armed Services Subcommittee on Strategic Forces Before the House Armed Services Subcommittee on Strategic Forces Before the House Armed Services Subcommittee on Strategic Forces By: Ines Tray, Assistant Secretary Office of Environmental Management Subject: EM FY 2011 Budget Request 3-25-10_Final_Testimony_(Triay).pdf (70.66 KB) More Documents & Publications Assistant Secretary Triay's Written Statement before the House Armed Services Subcommittee on Strategic Forces

  8. Before the Subcommittee on Strategic Forces - House Armed Services

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Committee | Department of Energy Strategic Forces - House Armed Services Committee Before the Subcommittee on Strategic Forces - House Armed Services Committee Testimony of Daniel B. Poneman, Deputy Secretary of Energy Before the Subcommittee on Strategic Forces - House Armed Services Committee 9-13-12_Daniel_Poneman_FT HASC.pdf (293.68 KB) More Documents & Publications Before the Subcommittee on Strategic Forces - House Committee on Armed Services Before the Subcommittee on Strategic

  9. Interagency Energy Management Task Force | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Energy Management Task Force Interagency Energy Management Task Force The Federal Interagency Energy Management Task Force was created by the Federal Energy Management Improvement Act of 1988 to coordinate federal government activities that encourage energy conservation and energy efficiency. Led by the Federal Energy Management Program director and composed of federal energy managers, this task force serves as a forum for: Sharing lessons learned across agencies Providing analysis on technical

  10. Joining Forces to Empower Veterans | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Joining Forces to Empower Veterans Joining Forces to Empower Veterans November 10, 2015 - 11:20am Addthis Joining Forces to Empower Veterans Sarah Wagoner Sarah Wagoner Communications Specialist, Wind and Water Power Technologies Office Through the Energy Department's partnership with the federal Joining Forces campaign, companies from the energy, manufacturing, transportation, and information technology sectors have committed to hiring approximately 90,000 veterans and military spouses through

  11. Collective behaviors of the Casimir force in microelectromechanical systems

    Office of Scientific and Technical Information (OSTI)

    (Technical Report) | SciTech Connect Collective behaviors of the Casimir force in microelectromechanical systems Citation Details In-Document Search Title: Collective behaviors of the Casimir force in microelectromechanical systems Our goal was to explore the strong dependence of the Casimir force on the shape of the interacting bodies. We made significant progress and measured the Casimir force on silicon surface with rectangular corrugation and showed that the results agree with

  12. V.P. Biden Hosts the Middle Class Task Force

    Broader source: Energy.gov [DOE]

    Secretary Chu will join Vice President Biden at the White House as he hosts a Middle Class Task Force event.

  13. Draft Report of the Task Force on Methane Hydrates

    Broader source: Energy.gov [DOE]

    This report presents the findings and recommendations for the Secretary of Energy Advisory Board (SEAB) Task Force on Methane Hydrates.

  14. Annual report on contractor work force restructuring, fiscal year 1997

    SciTech Connect (OSTI)

    1998-03-01

    This report summarizes work force restructuring and community transition activities at all sites. It outlines work force restructuring activity for FY 1997, changing separation patterns, cost savings and separation costs, program assessment, activities to mitigate restructuring impacts, community transition activities, status of displaced workers, lessons learned, and emerging issues in worker and community transition. Work force restructuring and community transition activities for defense nuclear sites are summarized, as are work force restructuring activities at non-defense sites.

  15. GeoVision Study Task Forces | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Study Task Forces GeoVision Study Task Forces The Energy Department's GeoVision Study is undertaking rigorous analysis in seven specific topic areas that are led by team members from our national labs. Each task force will produce a deliverable required by the scope of the project. Task forces will be coordinated by the National Renewable Energy Laboratory. I. Exploration: Lab Lead - Lawrence Berkeley National Laboratory How geothermal resources are identified today Exploration costs and risks

  16. Report of the Task Force on Methane Hydrates

    Broader source: Energy.gov [DOE]

    This report presents the findings and recommendations for the Secretary of Energy Advisory Board (SEAB) Task Force on Methane Hydrates.

  17. Interagency Energy Management Task Force | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    About the Federal Energy Management Program » Interagency Energy Management Task Force Interagency Energy Management Task Force The Federal Interagency Energy Management Task Force was created by the Federal Energy Management Improvement Act of 1988 to coordinate federal government activities that encourage energy conservation and energy efficiency. Led by the Federal Energy Management Program director and composed of federal energy managers, this task force serves as a forum for: Sharing

  18. Design of the IPIRG-2 simulated seismic forcing function

    SciTech Connect (OSTI)

    Olson, R.; Scott, P.; Wilkowski, G.

    1996-02-01

    A series of pipe system experiments was conducted in IPIRG-2 that used a realistic seismic forcing function. Because the seismic forcing function was more complex than the single-frequency increasing-amplitude sinusoidal forcing function used in the IPIRG-1 pipe system experiments, considerable effort went into designing the function. This report documents the design process for the seismic forcing function used in the IPIRG-2 pipe system experiments.

  19. Material fabrication using acoustic radiation forces

    DOE Patents [OSTI]

    Sinha, Naveen N.; Sinha, Dipen N.; Goddard, Gregory Russ

    2015-12-01

    Apparatus and methods for using acoustic radiation forces to order particles suspended in a host liquid are described. The particles may range in size from nanometers to millimeters, and may have any shape. The suspension is placed in an acoustic resonator cavity, and acoustical energy is supplied thereto using acoustic transducers. The resulting pattern may be fixed by using a solidifiable host liquid, forming thereby a solid material. Patterns may be quickly generated; typical times ranging from a few seconds to a few minutes. In a one-dimensional arrangement, parallel layers of particles are formed. With two and three dimensional transducer arrangements, more complex particle configurations are possible since different standing-wave patterns may be generated in the resonator. Fabrication of periodic structures, such as metamaterials, having periods tunable by varying the frequency of the acoustic waves, on surfaces or in bulk volume using acoustic radiation forces, provides great flexibility in the creation of new materials. Periodicities may range from millimeters to sub-micron distances, covering a large portion of the range for optical and acoustical metamaterials.

  20. Nuclear Radiological Threat Task Force Established | National Nuclear

    National Nuclear Security Administration (NNSA)

    Security Administration | (NNSA) Radiological Threat Task Force Established Nuclear Radiological Threat Task Force Established Washington, DC NNSA's Administrator Linton Brooks announces the establishment of the Nuclear Radiological Threat Reduction Task Force (NRTRTF) to combat the threats posed by radiological dispersion devices or "dirty bombs."

  1. CCS Task Force - Executive Summary | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    CCS Task Force - Executive Summary CCS Task Force - Executive Summary CCS Task Force - Executive Summary (90.47 KB) More Documents & Publications CCSTF - Final Report Before the Senate Energy and Natural Resources Committee Before the House Science, Space, and Technology Subcommittee on Energy and Environment

  2. Understanding the Role of Solvation Forces on the Preferential Attachment of Nanoparticles in Liquid

    SciTech Connect (OSTI)

    Welch, David A.; Woehl, Taylor J.; Park, Chiwoo; Faller, Roland; Evans, James E.; Browning, Nigel D.

    2015-11-20

    We discuss optimization of colloidal nanoparticle synthesis techniques, which requires an understanding of underlying particle growth mechanisms. Nonclassical growth mechanisms are particularly important as they affect nanoparticle size and shape distributions, which in turn influence functional properties. For example, preferential attachment of nanoparticles is known to lead to the formation of mesocrystals, although the formation mechanism is currently not well-understood. Here we employ in situ liquid cell scanning transmission electron microscopy and steered molecular dynamics (SMD) simulations to demonstrate that the experimentally observed preference for end-to-end attachment of silver nanorods is a result of weaker solvation forces occurring at rod ends. In conclusion, SMD reveals that when the side of a nanorod approaches another rod, perturbation in the surface-bound water at the nanorod surface creates significant energy barriers to attachment. Additionally, rod morphology (i.e., facet shape) effects can explain the majority of the side attachment effects that are observed experimentally.

  3. Band excitation method applicable to scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen [Knoxville, TN; Kalinin, Sergei V. [Knoxville, TN

    2010-08-17

    Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.

  4. Raman Microscopy of Lithium-Manganese-Rich Cathodes

    SciTech Connect (OSTI)

    Ruther, Rose E; Callender, Andrew F.; Zhou, Hui; Martha, Surendra; Nanda, Jagjit

    2014-01-01

    Lithium rich, manganese rich composites with general formula xLi2MnO3 (1-x)LiMO2 are promising candidates for high capacity and high voltage cathodes for lithium ion batteries. Lithium rich oxides crystallize as a nanocomposite of layered phases whose structure further evolves with electrochemical cycling. Raman spectroscopy is potentially a powerful tool to monitor the crystal chemistry and correlate phase changes with electrochemical behavior. While several groups have reported Raman spectra of lithium rich oxides, the data show considerable variability in terms of both the vibrational features observed and their interpretation. In this study Raman microscopy is used to investigate lithium-rich manganese-rich cathodes as a function of average charge and electrochemical cycling. LMR-NMC cycled at elevated temperature (60 C) has a modified crystal structure which may account for some of the observed increase in capacity. Contrary to some reports, no growth of a spinel phase is observed. However, analysis of the Raman spectra does indicate the structure of LMR-NMC deviates significantly from an ideal layered phase. The results also highlight the importance of using low laser power and large sample sizes to obtain consistent data sets.

  5. Band excitation method applicable to scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen; Kalinin, Sergei V

    2013-05-28

    Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.

  6. High-resolution electron microscopy of advanced materials

    SciTech Connect (OSTI)

    Mitchell, T.E.; Kung, H.H.; Sickafus, K.E.; Gray, G.T. III; Field, R.D.; Smith, J.F.

    1997-11-01

    This final report chronicles a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The High-Resolution Electron Microscopy Facility has doubled in size and tripled in quality since the beginning of the three-year period. The facility now includes a field-emission scanning electron microscope, a 100 kV field-emission scanning transmission electron microscope (FE-STEM), a 300 kV field-emission high-resolution transmission electron microscope (FE-HRTEM), and a 300 kV analytical transmission electron microscope. A new orientation imaging microscope is being installed. X-ray energy dispersive spectrometers for chemical analysis are available on all four microscopes; parallel electron energy loss spectrometers are operational on the FE-STEM and FE-HRTEM. These systems enable evaluation of local atomic bonding, as well as chemical composition in nanometer-scale regions. The FE-HRTEM has a point-to-point resolution of 1.6 {angstrom}, but the resolution can be pushed to its information limit of 1 {angstrom} by computer reconstruction of a focal series of images. HRTEM has been used to image the atomic structure of defects such as dislocations, grain boundaries, and interfaces in a variety of materials from superconductors and ferroelectrics to structural ceramics and intermetallics.

  7. Raman Microscopy of Lithium-Manganese-Rich Cathodes

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ruther, Rose E; Callender, Andrew F.; Zhou, Hui; Martha, Surendra; Nanda, Jagjit

    2014-01-01

    Lithium rich, manganese rich composites with general formula xLi2MnO3 (1-x)LiMO2 are promising candidates for high capacity and high voltage cathodes for lithium ion batteries. Lithium rich oxides crystallize as a nanocomposite of layered phases whose structure further evolves with electrochemical cycling. Raman spectroscopy is potentially a powerful tool to monitor the crystal chemistry and correlate phase changes with electrochemical behavior. While several groups have reported Raman spectra of lithium rich oxides, the data show considerable variability in terms of both the vibrational features observed and their interpretation. In this study Raman microscopy is used to investigate lithium-rich manganese-rich cathodes asmore » a function of average charge and electrochemical cycling. LMR-NMC cycled at elevated temperature (60 C) has a modified crystal structure which may account for some of the observed increase in capacity. Contrary to some reports, no growth of a spinel phase is observed. However, analysis of the Raman spectra does indicate the structure of LMR-NMC deviates significantly from an ideal layered phase. The results also highlight the importance of using low laser power and large sample sizes to obtain consistent data sets.« less

  8. Separation of distinct photoexcitation species in femtosecond transient absorption microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Xiao, Kai; Ma, Ying -Zhong; Simpson, Mary Jane; Doughty, Benjamin; Yang, Bing

    2016-02-03

    Femtosecond transient absorption microscopy is a novel chemical imaging capability with simultaneous high spatial and temporal resolution. Although several powerful data analysis approaches have been developed and successfully applied to separate distinct chemical species in such images, the application of such analysis to distinguish different photoexcited species is rare. In this paper, we demonstrate a combined approach based on phasor and linear decomposition analysis on a microscopic level that allows us to separate the contributions of both the excitons and free charge carriers in the observed transient absorption response of a composite organometallic lead halide perovskite film. We found spatialmore » regions where the transient absorption response was predominately a result of excitons and others where it was predominately due to charge carriers, and regions consisting of signals from both contributors. Lastly, quantitative decomposition of the transient absorption response curves further enabled us to reveal the relative contribution of each photoexcitation to the measured response at spatially resolved locations in the film.« less

  9. Thin dielectric film thickness determination by advanced transmission electron microscopy

    SciTech Connect (OSTI)

    Diebold, A.C.; Foran, B.; Kisielowski, C.; Muller, D.; Pennycook, S.; Principe, E.; Stemmer, S.

    2003-09-01

    High Resolution Transmission Electron Microscopy (HR-TEM) has been used as the ultimate method of thickness measurement for thin films. The appearance of phase contrast interference patterns in HR-TEM images has long been confused as the appearance of a crystal lattice by non-specialists. Relatively easy to interpret crystal lattice images are now directly observed with the introduction of annular dark field detectors for scanning TEM (STEM). With the recent development of reliable lattice image processing software that creates crystal structure images from phase contrast data, HR-TEM can also provide crystal lattice images. The resolution of both methods was steadily improved reaching now into the sub Angstrom region. Improvements in electron lens and image analysis software are increasing the spatial resolution of both methods. Optimum resolution for STEM requires that the probe beam be highly localized. In STEM, beam localization is enhanced by selection of the correct aperture. When STEM measurement is done using a highly localized probe beam, HR-TEM and STEM measurement of the thickness of silicon oxynitride films agree within experimental error. In this paper, the optimum conditions for HR-TEM and STEM measurement are discussed along with a method for repeatable film thickness determination. The impact of sample thickness is also discussed. The key result in this paper is the proposal of a reproducible method for film thickness determination.

  10. TRANSMISSION ELECTRON MICROSCOPY STUDY OF HELIUM BEARING FUSION WELDS

    SciTech Connect (OSTI)

    Tosten, M; Michael Morgan, M

    2008-12-12

    A transmission electron microscopy (TEM) study was conducted to characterize the helium bubble distributions in tritium-charged-and-aged 304L and 21Cr-6Ni-9Mn stainless steel fusion welds containing approximately 150 appm helium-3. TEM foils were prepared from C-shaped fracture toughness test specimens containing {delta} ferrite levels ranging from 4 to 33 volume percent. The weld microstructures in the low ferrite welds consisted mostly of austenite and discontinuous, skeletal {delta} ferrite. In welds with higher levels of {delta} ferrite, the ferrite was more continuous and, in some areas of the 33 volume percent sample, was the matrix/majority phase. The helium bubble microstructures observed were similar in all samples. Bubbles were found in the austenite but not in the {delta} ferrite. In the austenite, bubbles had nucleated homogeneously in the grain interiors and heterogeneously on dislocations. Bubbles were not found on any austenite/austenite grain boundaries or at the austenite/{delta} ferrite interphase interfaces. Bubbles were not observed in the {delta} ferrite because of the combined effects of the low solubility and rapid diffusion of tritium through the {delta} ferrite which limited the amount of helium present to form visible bubbles.

  11. Analytical Microscopy. National Renewable Energy Laboratory (NREL) Measurements and Charactization (Fact Sheet).

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    MAJOR INSTRUMENTATION FOR TRANSMISSION ELECTRON MICROSCOPY Special Features Lateral Resolution Typical Applications Analytical Technique System FEI F20 (UT) Phillips CM30 Transmission electron microscopy Structural and compositional analysis and lattice imaging 0.23 nm High-resolution, EDS Field-emission scanning transmission electron microscopy Structural, electronic, and compositional analysis; elemental mapping; lattice imaging 0.19 nm for HRTEM; 0.14 nm for Z-contrast STEM High-resolution,

  12. Ultrafast optical pump-probe spectroscopy is used to reveal the coexistence of coupled antiferromagnetic (AFM)/ferroelectric (FE) and ferromagnetic (FM) orders in multiferroic TbMnO3 films, which can guide researchers in creating new kinds of multiferroic materials.

    SciTech Connect (OSTI)

    Qi, Jingbo; Zhu, Jianxin; Trugman, Stuart A.; Taylor, Antoinette; Jia, Quanxi; Prasankumar, Rohit

    2012-07-06

    Multiferroic materials have attracted much interest in the past decade, due not only to their novel device applications, but also their manifestations of coupling and interactions between different order parameters (particularly electric polarization and magnetic order). Recently, much attention has been focused on perovskite manganites, RMnO{sub 3} (R = rare earth ions), due to the discovery of a large magnetoelectric effect in these materials. The first member of this family to be discovered was TbMnO{sub 3} (TMO), which is now well established as a typical magnetoelectric multiferroic. Extensive experimental and theoretical studies have already been done on single crystal TMO (SC-TMO). In brief, SC-TMO, with a distorted orthorhombic perovskite structure, has an antiferromagnetic (AFM) phase transition at T{sub N} {approx}40 K with sinusoidally ordered Mn moments. Below T{sub FE} {approx} 28 K, ferroelectric (FE) order develops owing to the appearance of cycloidal spiral spin structure. In contrast, there are relatively few reports describing the properties of TMO thin films (typically grown on SrTiO{sub 3} (STO) substrates). In general, thin films can enable new functionality in materials, as their physical parameters can be changed by modifying their structure via strain imposed by the substrate. Strain in particular has the potential to directly couple FE and FM orders, which is very rare. This could benefit electronic device applications by providing low power consumption, high speed operation, and greater electric/magnetic field controllability. Previous investigations of magnetic properties in TMO films revealed an unexpected ferromagnetic (FM) order, in contrast to SC-TMO. However, several important questions regarding these films are still unanswered for instance: (1) What mechanism induces FM order? (2) Can FM, sinusoidal AFM and spiral AFM (or FE) orders coexist? (3) Can FM order be coupled to FE order? To fully understand these unique materials

  13. A New Method of Comparing Forcing Agents in Climate Models

    SciTech Connect (OSTI)

    Kravitz, Benjamin S.; MacMartin, Douglas; Rasch, Philip J.; Jarvis, Andrew

    2015-10-14

    We describe a new method of comparing different climate forcing agents (e.g., CO2, CH4, and solar irradiance) that avoids many of the ambiguities introduced by temperature-related climate feedbacks. This is achieved by introducing an explicit feedback loop external to the climate model that adjusts one forcing agent to balance another while keeping global mean surface temperature constant. Compared to current approaches, this method has two main advantages: (i) the need to define radiative forcing is bypassed and (ii) by maintaining roughly constant global mean temperature, the effects of state dependence on internal feedback strengths are minimized. We demonstrate this approach for several different forcing agents and derive the relationships between these forcing agents in two climate models; comparisons between forcing agents are highly linear in concordance with predicted functional forms. Transitivity of the relationships between the forcing agents appears to hold within a wide range of forcing. The relationships between the forcing agents obtained from this method are consistent across both models but differ from relationships that would be obtained from calculations of radiative forcing, highlighting the importance of controlling for surface temperature feedback effects when separating radiative forcing and climate response.

  14. Costs of strikes between vulnerable missile forces

    SciTech Connect (OSTI)

    Canavan, G.H.

    1997-02-01

    This note derives the first and second strike magnitudes and costs for strikes between vulnerable missile forces with multiple warheads. The extension to mixes with invulnerable missiles is performed in a companion note. Stability increases as the number of weapons per missile is reduced. The optimal allocation of weapons between missiles and value is significant in predicting the stability impact of the reduction of the number of weapons per missile at large numbers of missiles, less significant in reducing the number of missiles for fixed weapons per missile. At low numbers of missiles, the stability indices for singlet and triplet configurations are comparable, as are the number of weapons each would deliver on value targets.

  15. Forcing continuous reconnection in hybrid simulations

    SciTech Connect (OSTI)

    Laitinen, T. V. Janhunen, P.; Jarvinen, R.; Kallio, E.

    2014-07-15

    We have performed hybrid simulations of driven continuous reconnection with open boundary conditions. Reconnection is started by a collision of two subsonic plasma fronts with opposite magnetic fields, without any specified magnetic field configuration as initial condition. Due to continued forced plasma inflow, a current sheet co-located with a dense and hot plasma sheet develops. The translational symmetry of the current sheet is broken by applying a spatial gradient in the inflow speed. We compare runs with and without localized resistivity: reconnection is initiated in both cases, but localized resistivity stabilizes it and enhances its efficiency. The outflow speed reaches about half of Alfvn speed. We quantify the conversion of magnetic energy to kinetic energy of protons and to Joule heating and show that with localized resistivity, kinetic energy of protons is increased on average five-fold in the reconnection in our simulation case.

  16. Information-based physics, influence, and forces

    SciTech Connect (OSTI)

    Walsh, James Lyons; Knuth, Kevin H.

    2015-01-13

    In recent works, Knuth and Bahreyni have demonstrated that the concepts of space and time are emergent in a coarse-grained model of direct particle-particle influence. In addition, Knuth demonstrated that observer-made inferences regarding the free particle, which is defined as a particle that influences others, but is not itself influenced, result in a situation identical to the Feynman checkerboard model of the Dirac equation. This suggests that the same theoretical framework that gives rise to an emergent spacetime is consistent with quantum mechanics. In this paper, we begin to explore the effect of influence on the emergent properties of a particle. This initial study suggests that when a particle is influenced, it is interpreted as accelerating in a manner consistent with special relativity implying that, at least in this situation, influence can be conceived of as a force.

  17. Soft x-ray microscopy - a powerful analytical tool to image magnetism...

    Office of Scientific and Technical Information (OSTI)

    This article reviews the recent achievements of magnetic soft X-ray microscopy by selected examples of spin torque phenomena, stochastical behavior on the nanoscale and spin ...

  18. 3?m aperture probes for near-field terahertz transmission microscopy...

    Office of Scientific and Technical Information (OSTI)

    3?m aperture probes for near-field terahertz transmission microscopy. Citation Details In-Document Search Title: 3?m aperture probes for near-field terahertz transmission ...

  19. Viewing spin structures with soft x-ray microscopy (Journal Article...

    Office of Scientific and Technical Information (OSTI)

    provided by state-of-the-art X-ray optics and fast time resolution limited by the ... PROPERTIES; MAGNETISM; MICROSCOPY; OPTICS; SENSORS; SPATIAL RESOLUTION; SPIN; TIME ...

  20. Transmission electron microscopy of whiskers and hillocks formed on Al films deposited onto a glass

    SciTech Connect (OSTI)

    Saka, H.; Fujino, S.; Kuroda, K. [Department of Quantum Engineering, Nagoya University, Nagoya 464-01 (Japan); Tsujimoto, K.; Tsuji, S. [Display Technology, IBM Japan, Ltd., Shimotsuruma, Yamato, Kanagawa 242 (Japan); Takatsuji, H. [Display Technology, IBM Japan, Ltd., Ichimiyake, Yasu-gun, Shiga 520-23 (Japan)

    1998-01-05

    Whiskers and hillocks formed on an Al film deposited onto a glass substrate have been observed by means of a variety of transmission electron microscopy technique.

  1. Total aerosol effect: forcing or radiative flux perturbation?

    SciTech Connect (OSTI)

    Lohmann, Ulrike; Storelvmo, Trude; Jones, Andy; Rotstayn, Leon; Menon, Surabi; Quaas, Johannes; Ekman, Annica; Koch, Dorothy; Ruedy, Reto

    2009-09-25

    Uncertainties in aerosol forcings, especially those associated with clouds, contribute to a large extent to uncertainties in the total anthropogenic forcing. The interaction of aerosols with clouds and radiation introduces feedbacks which can affect the rate of rain formation. Traditionally these feedbacks were not included in estimates of total aerosol forcing. Here we argue that they should be included because these feedbacks act quickly compared with the time scale of global warming. We show that for different forcing agents (aerosols and greenhouse gases) the radiative forcings as traditionally defined agree rather well with estimates from a method, here referred to as radiative flux perturbations (RFP), that takes these fast feedbacks and interactions into account. Thus we propose replacing the direct and indirect aerosol forcing in the IPCC forcing chart with RFP estimates. This implies that it is better to evaluate the total anthropogenic aerosol effect as a whole.

  2. Imaging doped silicon test structures using low energy electron microscopy.

    SciTech Connect (OSTI)

    Nakakura, Craig Yoshimi; Anderson, Meredith Lynn; Kellogg, Gary Lee

    2010-01-01

    This document is the final SAND Report for the LDRD Project 105877 - 'Novel Diagnostic for Advanced Measurements of Semiconductor Devices Exposed to Adverse Environments' - funded through the Nanoscience to Microsystems investment area. Along with the continuous decrease in the feature size of semiconductor device structures comes a growing need for inspection tools with high spatial resolution and high sample throughput. Ideally, such tools should be able to characterize both the surface morphology and local conductivity associated with the structures. The imaging capabilities and wide availability of scanning electron microscopes (SEMs) make them an obvious choice for imaging device structures. Dopant contrast from pn junctions using secondary electrons in the SEM was first reported in 1967 and more recently starting in the mid-1990s. However, the serial acquisition process associated with scanning techniques places limits on the sample throughput. Significantly improved throughput is possible with the use of a parallel imaging scheme such as that found in photoelectron emission microscopy (PEEM) and low energy electron microscopy (LEEM). The application of PEEM and LEEM to device structures relies on contrast mechanisms that distinguish differences in dopant type and concentration. Interestingly, one of the first applications of PEEM was a study of the doping of semiconductors, which showed that the PEEM contrast was very sensitive to the doping level and that dopant concentrations as low as 10{sup 16} cm{sup -3} could be detected. More recent PEEM investigations of Schottky contacts were reported in the late 1990s by Giesen et al., followed by a series of papers in the early 2000s addressing doping contrast in PEEM by Ballarotto and co-workers and Frank and co-workers. In contrast to PEEM, comparatively little has been done to identify contrast mechanisms and assess the capabilities of LEEM for imaging semiconductor device strictures. The one exception is the

  3. Transmission electron microscopy analysis of corroded metal waste forms.

    SciTech Connect (OSTI)

    Dietz, N. L.

    2005-04-15

    This report documents the results of analyses with transmission electron microscopy (TEM) combined with energy dispersive X-ray spectroscopy (EDS) and selected area electron diffraction (ED) of samples of metallic waste form (MWF) materials that had been subjected to various corrosion tests. The objective of the TEM analyses was to characterize the composition and microstructure of surface alteration products which, when combined with other test results, can be used to determine the matrix corrosion mechanism. The examination of test samples generated over several years has resulted in refinements to the TEM sample preparation methods developed to preserve the orientation of surface alteration layers and the underlying base metal. The preservation of microstructural spatial relationships provides valuable insight for determining the matrix corrosion mechanism and for developing models to calculate radionuclide release in repository performance models. The TEM results presented in this report show that oxide layers are formed over the exposed steel and intermetallic phases of the MWF during corrosion in aqueous solutions and humid air at elevated temperatures. An amorphous non-stoichiometric ZrO{sub 2} layer forms at the exposed surfaces of the intermetallic phases, and several nonstoichiometric Fe-O layers form over the steel phases in the MWF. These oxide layers adhere strongly to the underlying metal, and may be overlain by one or more crystalline Fe-O phases that probably precipitated from solution. The layer compositions are consistent with a corrosion mechanism of oxidative dissolution of the steel and intermetallic phases. The layers formed on the steel and intermetallic phases form a continuous layer over the exposed waste form, although vertical splits in the layer and corrosion in pits and crevices were seen in some samples. Additional tests and analyses are needed to verify that these layers passivate the underlying metals and if passivation can break

  4. U.S. - Canada Power System Outage Task Force: Final Report on...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    - Canada Power System Outage Task Force: Final Report on the Implementation of Task Force Recommendations U.S. - Canada Power System Outage Task Force: Final Report on the ...

  5. Work_Force_Restructuring_Activities_December_10_2008.pdf | Department...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    WorkForceRestructuringActivitiesDecember102008.pdf WorkForceRestructuringActivitiesDecember102008.pdf PDF icon WorkForceRestructuringActivitiesDecember102008.pdf ...

  6. Unforced, Forced and Resonance-Forced Waves in a Spherical Atmosphere

    SciTech Connect (OSTI)

    Covey, Curt

    2015-10-27

    This technical report discusses a longstanding issue of atmospheric tides in weather-prediction and general circulation models (GCMs). Tidal signatures consistent with observations have appeared in the surface pressure output of GCMs since their inception (Hardy 1968, Hunt and Manabe 1968). Such models, however, are sufficiently complicated that the possibility of “getting the right answer for the wrong reasons” arises. Lindzen et al. (1968, hereafter LBK) showed that wave reflection at the upper boundary of a GCM can artificially enhance the tides. Covey et al. (2011, 2014) found that tidal output from a number of modern GCMs is surprisingly independent of their forcing. This finding is consistent with earlier suggestions that a compensating effect occurs in some models: lowering the model top reduces the forcing (solar heating of the ozone layer) but also enhances spurious wave reflection (Zwiers and Hamilton 1986, Hamilton et al. 2008).

  7. A TRANSMISSION ELECTRON MICROSCOPY STUDY OF PRESOLAR HIBONITE

    SciTech Connect (OSTI)

    Zega, Thomas J.; Stroud, Rhonda M.; Alexander, Conel M. O'D.; Nittler, Larry R.

    2011-04-01

    We report isotopic and microstructural data on five presolar hibonite grains (KH1, KH2, KH6, KH15, and KH21) identified in an acid residue of the Krymka LL3.1 ordinary chondrite. Isotopic measurements by secondary ion mass spectrometry (SIMS) verified a presolar circumstellar origin for the grains. Transmission electron microscopy (TEM) examination of the crystal structure and chemistry of the grains was enabled by in situ sectioning and lift-out with a focused-ion-beam scanning-electron microscope (FIB-SEM). Comparisons of isotopic compositions with models indicate that four of the five grains formed in low-mass stars that evolved through the red giant/asymptotic giant branches (RGBs/AGBs), whereas one grain formed in the ejecta of a Type II supernova. Selected-area electron-diffraction patterns show that all grains are single crystals of hibonite. Some grains contain minor structural perturbations (stacking faults) and small spreads in orientation that can be attributed to a combination of growth defects and mechanical processing by grain-grain collisions. The similar structure of the supernova grain to those from RGB/AGB stars indicates a similarity in the formation conditions. Radiation damage (e.g., point defects), if present, occurs below our detection limit. Of the five grains we studied, only one has the pure hibonite composition of CaAl{sub 12}O{sub 19}. All others contain minor amounts of Mg, Si, Ti, and Fe. The microstructural data are generally consistent with theoretical predictions, which constrain the circumstellar condensation temperature to a range of 1480-1743 K, assuming a corresponding total gas pressure between 1 x 10{sup -6} and 1 x 10{sup -3} atm. The TEM data were also used to develop a calibration for SIMS determination of Ti contents in oxide grains. Grains with extreme {sup 18}O depletions, indicating deep mixing has occurred in their parent AGB stars, are slightly Ti enriched compared with grains from stars without deep mixing, most

  8. Multi-range force sensors utilizing shape memory alloys

    DOE Patents [OSTI]

    Varma, Venugopal K.

    2003-04-15

    The present invention provides a multi-range force sensor comprising a load cell made of a shape memory alloy, a strain sensing system, a temperature modulating system, and a temperature monitoring system. The ability of the force sensor to measure contact forces in multiple ranges is effected by the change in temperature of the shape memory alloy. The heating and cooling system functions to place the shape memory alloy of the load cell in either a low temperature, low strength phase for measuring small contact forces, or a high temperature, high strength phase for measuring large contact forces. Once the load cell is in the desired phase, the strain sensing system is utilized to obtain the applied contact force. The temperature monitoring system is utilized to ensure that the shape memory alloy is in one phase or the other.

  9. Task Force on Biofuels Infrastructure | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Task Force on Biofuels Infrastructure Task Force on Biofuels Infrastructure Under the federal Renewable Fuels Standard (RFS) adopted in 2005 and amended in 2007, the United States is committed to a substantial (five-fold) increase in its use of biofuels by 2022. The National Commission on Energy Policy (NCEP) convened a Biofuels Infrastructure Task Force in 2008 to examine the infrastructure implications of this relatively swift and unprecedented shift in the composition of the nation's

  10. Observed Aerosol Radiative Forcings: Comparison for Natural and Anthropogenic Sources

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Aerosol Radiative Forcings: Comparison for Natural and Anthropogenic Sources A. M. Vogelmann Center for Atmospheric Sciences and Center for Clouds, Chemistry and Climate Scripps Institution of Oceanography University of California San Diego, California Introduction The modeling of radiative forcing, and aerosol radiative forcing in particular, is one of the largest uncertainties in predicting climate change (Hansen et al. 1998). Addressing this uncertainty first requires an accurate

  11. Casimir Forces On A Silicon Micromechanical Chip (Journal Article) |

    Office of Scientific and Technical Information (OSTI)

    SciTech Connect Journal Article: Casimir Forces On A Silicon Micromechanical Chip Citation Details In-Document Search Title: Casimir Forces On A Silicon Micromechanical Chip Quantum fluctuations give rise to van der Waals and Casimir forces that dominate the interaction between electrically neutral objects at sub-micron separations. Under the trend of miniaturization, such quantum electrodynamical effects are expected to play an important role in micro- and nano-mechanical devices.

  12. Renewable Hydrogen Production at Hickam Air Force Base | Department of

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Energy at Hickam Air Force Base Renewable Hydrogen Production at Hickam Air Force Base Presented at the Renewable Hydrogen Workshop, Nov. 16, 2009, in Palm Springs, CA renewable_hydrogen_workshop_nov16_quinn.pdf (920.39 KB) More Documents & Publications Hickam Air Force Base Fuel Cell Vehicles: Early Implementation Experience Fuel Cell Hybrid Bus Lands at Hickam AFB: Hydrogen Fuel Cell & Infrastructure Technologies Program, Fuel Cell Bus Demonstration Project (Fact Sheet) Hawaii

  13. Federal Task Force Sends Recommendations to President on Fostering Clean

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Coal Technology | Department of Energy Task Force Sends Recommendations to President on Fostering Clean Coal Technology Federal Task Force Sends Recommendations to President on Fostering Clean Coal Technology August 12, 2010 - 12:00am Addthis WASHINGTON - President Obama's Interagency Task Force on Carbon Capture and Storage (CCS), co-chaired by the U.S. Environmental Protection Agency (EPA) and the Department of Energy (DOE), delivered a series of recommendations to the president today on

  14. Before the House Armed Services Subcommittee on Strategic Forces |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy Armed Services Subcommittee on Strategic Forces Before the House Armed Services Subcommittee on Strategic Forces Before the House Armed Services Subcommittee on Strategic Forces By: Glenn Podonsky, Chief Health, Safety and Security Officer Subject: FY 2010 Budget Request 5_13_09_HSS_Fin_Testimony.pdf (109.5 KB) More Documents & Publications USW Health Safety and Environment Conference - HSS Workshop Department of Energy Office of Health, Safety and Security(HSS)

  15. Before the Subcommittee on Strategic Forces - House Committee on Armed

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Services | Department of Energy Committee on Armed Services Before the Subcommittee on Strategic Forces - House Committee on Armed Services Testimony of Daniel B. Poneman, Deputy Secretary of Energy Before the Subcommittee on Strategic Forces - House Committee on Armed Services 2-28-13_Daniel_Poneman FT HAS.pdf (134.4 KB) More Documents & Publications Before the Subcommittee on Strategic Forces - House Armed Services Committee

  16. Protective Force Protocols for ESS Supported Performance Tests and

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Exercises, March 12, 2007 | Department of Energy Protective Force Protocols for ESS Supported Performance Tests and Exercises, March 12, 2007 Protective Force Protocols for ESS Supported Performance Tests and Exercises, March 12, 2007 March 12, 2008 The DOE/NNSA has an established process for determining the effectiveness of a site's overall protection system, and a vital part of this process is the use of performance testing. This document - Protective Force Protocols for Engagement

  17. Fuel Cell Companies Commit to Hiring Veterans Through Joining Forces

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Initiative | Department of Energy Companies Commit to Hiring Veterans Through Joining Forces Initiative Fuel Cell Companies Commit to Hiring Veterans Through Joining Forces Initiative May 9, 2016 - 11:55am Addthis First Lady Michelle Obama and representatives of the fuel cell company, PDC Machines. The April event announced new private-sector commitments to train or hire 90,000 veterans and military spouses through the Joining Forces Initiative. Two Fuel Cell Technologies Office-supported

  18. Gregory H. Friedman: Before the Subcommittee on Strategic Forces Committee

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    on Armed Services U.S. House of Representatives | Department of Energy Strategic Forces Committee on Armed Services U.S. House of Representatives Gregory H. Friedman: Before the Subcommittee on Strategic Forces Committee on Armed Services U.S. House of Representatives February 28, 2013 Before the Subcommittee on Strategic Forces Committee on Armed Services U.S. House of Representatives Statement of Gregory H. Friedman, Inspector General, Department of Energy Mr. Chairman and Members of the

  19. Microsoft Word - Energy Code Enforcement Funding Task Force - Fact Sheet

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    [Final].docx | Department of Energy Energy Code Enforcement Funding Task Force - Fact Sheet [Final].docx Microsoft Word - Energy Code Enforcement Funding Task Force - Fact Sheet [Final].docx Microsoft Word - Energy Code Enforcement Funding Task Force - Fact Sheet [Final].docx (221.19 KB) More Documents & Publications Sonoma County Solar Implementation Plan Final Report - Grow Solar Wisconsin Team Energy Industry Days Additional Information

  20. University Research Reactor Task Force to the Nuclear Energy Research

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Advisory Committee | Department of Energy University Research Reactor Task Force to the Nuclear Energy Research Advisory Committee University Research Reactor Task Force to the Nuclear Energy Research Advisory Committee In mid-February, 2001 The University Research Reactor (URR) Task Force (TF), a sub-group of the Department of Energy (DOE) Nuclear Energy Research Advisory Committee (NERAC), was asked to: * Analyze information collected by DOE, the NERAC "Blue Ribbon Panel,"