National Library of Energy BETA

Sample records for focused-ion beam instrument

  1. Focused ion beam system

    DOE Patents [OSTI]

    Leung, K.; Gough, R.A.; Ji, Q.; Lee, Y.Y.

    1999-08-31

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 {mu}m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 m or less. 13 figs.

  2. Focused ion beam system

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Gough, Richard A.; Ji, Qing; Lee, Yung-Hee Yvette

    1999-01-01

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 .mu.m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 .mu.m or less.

  3. Focused ion beam source method and apparatus

    DOE Patents [OSTI]

    Pellin, Michael J.; Lykke, Keith R.; Lill, Thorsten B.

    2000-01-01

    A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud of laser ablated particles having unique characteristics, and extracting and focusing a charged particle beam from the laser ablated cloud. The method is especially suited for producing focused ion beams for semiconductor device analysis and modification.

  4. Focused ion beam micromilling and articles therefrom

    DOE Patents [OSTI]

    Lamartine, Bruce C. (Los Alamos, NM); Stutz, Roger A. (Los Alamos, NM)

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  5. Focused ion beam micromilling and articles therefrom

    DOE Patents [OSTI]

    Lamartine, B.C.; Stutz, R.A.

    1998-06-30

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  6. Development of a focused ion beam micromachining system

    SciTech Connect (OSTI)

    Pellerin, J.G.; Griffis, D.; Russell, P.E.

    1988-12-01

    Focused ion beams are currently being investigated for many submicron fabrication and analytical purposes. An FIB micromachining system consisting of a UHV vacuum system, a liquid metal ion gun, and a control and data acquisition computer has been constructed. This system is being used to develop nanofabrication and nanomachining techniques involving focused ion beams and scanning tunneling microscopes.

  7. Ultrahigh vacuum focused ion beam micromill and articles therefrom

    DOE Patents [OSTI]

    Lamartine, B.C.; Stutz, R.A.

    1998-02-24

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  8. Ultrahigh vacuum focused ion beam micromill and articles therefrom

    DOE Patents [OSTI]

    Lamartine, Bruce C. (Los Alamos, NM); Stutz, Roger A. (Los Alamos, NM)

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  9. Focused ion beam and scanning electron microscopy for 3D materials...

    Office of Scientific and Technical Information (OSTI)

    microscopy for 3D materials characterization. Citation Details In-Document Search Title: Focused ion beam and scanning electron microscopy for 3D materials characterization. ...

  10. Implementation of focused ion beam (FIB) system in characterization of nuclear fuels and materials

    SciTech Connect (OSTI)

    A. Aitkaliyeva; J. W. Madden; B. D. Miller; J I Cole; T A Hyde

    2014-10-01

    Beginning in 2007, a program was established at the Idaho National Laboratory to update key capabilities enabling microstructural and micro-chemical characterization of highly irradiated and/or radiologically contaminated nuclear fuels and materials at scales that previously had not been achieved for these types of materials. Such materials typically cannot be contact handled and pose unique hazards to instrument operators, facilities, and associated personnel. One of the first instruments to be acquired was a Dual Beam focused ion beam (FIB)-scanning electron microscope (SEM) to support preparation of transmission electron microscopy and atom probe tomography samples. Over the ensuing years, techniques have been developed and operational experience gained that has enabled significant advancement in the ability to characterize a variety of fuel types including metallic, ceramic, and coated particle fuels, obtaining insights into in-reactor degradation phenomena not obtainable by any other means. The following article describes insights gained, challenges encountered, and provides examples of unique results obtained in adapting Dual Beam FIB technology to nuclear fuels characterization.

  11. Site-controlled fabrication of Ga nanodroplets by focused ion beam

    SciTech Connect (OSTI)

    Xu, Xingliang; Wang, Zhiming M.; Wu, Jiang; Li, Handong; Zhou, Zhihua; Wang, Xiaodong

    2014-03-31

    Ga droplets are created by focused ion beam irradiation of GaAs surface. We report that ordered Ga droplets can be formed on the GaAs surface without any implantation damage. The droplets are characterized with bigger sizes than those droplets formed on damaged area. These aligned Ga droplets are formed via the migration of Ga atoms from ion irradiation area to the edge of undamaged GaAs surface and further nucleation into droplets. The morphological evolution and size distribution of these nanodroplets are investigated systematically with different beam irradiation time and incident angles. Based on this method, well positioned Ga nanodroplets, such as chains, are achieved by using focus ion beam patterning. The controllable assembly of droplets on undamaged semiconductor surface can be used to fabricate templates, to fabricate quantum structures and quantum devices by droplet epitaxy technique.

  12. Large Area Microcorrals and Cavity Formation on Cantilevers using a Focused Ion Beam

    SciTech Connect (OSTI)

    Saraf, Laxmikant V.; Britt, David W.

    2011-09-14

    We utilize focused ion beam (FIB) to explore various sputtering parameters to form large area microcorrals and cavities on cantilevers. Microcorrals were rapidly created by modifying ion beam blur and overlaps. Modification in FIB sputtering parameters affects the periodicity and shape of corral microstructure. Cantilever deflections show ion beam amorphization effects as a function of sputtered area and cantilever base cavities with or without side walls. The FIB sputtering parameters address a method for rapid creation of a cantilever tensiometer with integrated fluid storage and delivery.

  13. Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

    SciTech Connect (OSTI)

    Overweg, H. C.; Haan, A. M. J. den; Eerkens, H. J.; Bossoni, L.; Oosterkamp, T. H.; Alkemade, P. F. A.; La Rooij, A. L.; Spreeuw, R. J. C.

    2015-08-17

    We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10{sup −12} Am{sup 2}, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.

  14. The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions

    SciTech Connect (OSTI)

    Cooper, David; Twitchett-Harrison, Alison C.; Midgley, Paul A.; Dunin-Borkowski, Rafal E.

    2007-05-01

    Electron beam irradiation is shown to significantly influence phase images recorded from focused ion beam milled GaAs p-n junction specimens examined using off-axis electron holography in the transmission electron microscope. Our results show that the use of improved electrical connections to the specimen overcomes this problem, and may allow the correct built in potential across the junction to be recovered.

  15. FINAL FOCUS ION BEAM INTENSITY FROM TUNGSTEN FOIL CALORIMETER AND SCINTILLATOR IN NDCX-I

    SciTech Connect (OSTI)

    Lidia, S.M.; Bieniosek, F.; Henestroza, E.; Ni, P.; Seidl, P.

    2010-04-30

    Laboratory high energy density experiments using ion beam drivers rely upon the delivery of high-current, high-brightness ion beams with high peak intensity onto targets. Solid-state scintillators are typically used to measure the ion beam spatial profile but they display dose-dependent degradation and aging effects. These effects produce uncertainties and limit the accuracy of measuring peak beam intensities delivered to the target. For beam tuning and characterizing the incident beam intensity, we have developed a cross-calibrating diagnostic suite that extends the upper limit of measurable peak intensity dynamic range. Absolute intensity calibration is obtained with a 3 {micro}m thick tungsten foil calorimeter and streak spectrometer. We present experimental evidence for peak intensity measures in excess of 400 kW/cm{sup 2} using a 0.3 MV, 25 mA, 5-20 {micro}sec K{sup +1} beam. Radiative models and thermal diffusion effects are discussed because they affect temporal and spatial resolution of beam intensity profiles.

  16. High-pressure generation using double stage micro-paired diamond anvils shaped by focused ion beam

    SciTech Connect (OSTI)

    Sakai, Takeshi Ohfuji, Hiroaki; Yagi, Takehiko; Irifune, Tetsuo; Ohishi, Yasuo; Hirao, Naohisa; Suzuki, Yuya; Kuroda, Yasushi; Asakawa, Takayuki; Kanemura, Takashi

    2015-03-15

    Micron-sized diamond anvils with a 3 ?m culet were successfully processed using a focused ion beam (FIB) system and the generation of high pressures was confirmed using the double stage diamond anvil cell technique. The difficulty of aligning two second-stage micro-anvils was solved via the paired micro-anvil method. Micro-manufacturing using a FIB system enables us to control anvil shape, process any materials, including nano-polycrystalline diamond and single crystal diamond, and assemble the sample exactly in a very small space between the second-stage anvils. This method is highly reproducible. High pressures over 300 GPa were achieved, and the pressure distribution around the micro-anvil culet was evaluated by using a well-focused synchrotron micro-X-ray beam.

  17. Focused-ion-beam induced damage in thin films of complex oxide BiFeO{sub 3}

    SciTech Connect (OSTI)

    Siemons, W.; Beekman, C.; Budai, J. D.; Christen, H. M.; Fowlkes, J. D.; Balke, N.; Tischler, J. Z.; Xu, R.; Liu, W.; Gonzales, C. M.

    2014-02-01

    An unexpected, strong deterioration of crystal quality is observed in epitaxial perovskite BiFeO{sub 3} films in which microscale features have been patterned by focused-ion-beam (FIB) milling. Specifically, synchrotron x-ray microdiffraction shows that the damaged region extends to tens of μm, but does not result in measureable changes to morphology or stoichiometry. Therefore, this change would go undetected with standard laboratory equipment, but can significantly influence local material properties and must be taken into account when using a FIB to manufacture nanostructures. The damage is significantly reduced when a thin metallic layer is present on top of the film during the milling process, clearly indicating that the reduced crystallinity is caused by ion beam induced charging.

  18. Plasma focus ion beam fluence and fluxFor various gases

    SciTech Connect (OSTI)

    Lee, S. [Centre for Plasma Research, INTI International University, 71800 Nilai (Malaysia) [Centre for Plasma Research, INTI International University, 71800 Nilai (Malaysia); Institute for Plasma Focus Studies, 32 Oakpark Drive, Chadstone 3148 (Australia); Physics Department, University of Malaya (Malaysia); Saw, S. H. [Centre for Plasma Research, INTI International University, 71800 Nilai (Malaysia) [Centre for Plasma Research, INTI International University, 71800 Nilai (Malaysia); Institute for Plasma Focus Studies, 32 Oakpark Drive, Chadstone 3148 (Australia)

    2013-06-15

    A recent paper derived benchmarks for deuteron beam fluence and flux in a plasma focus (PF) [S. Lee and S. H. Saw, Phys. Plasmas 19, 112703 (2012)]. In the present work we start from first principles, derive the flux equation of the ion beam of any gas; link to the Lee Model code and hence compute the ion beam properties of the PF. The results show that, for a given PF, the fluence, flux, ion number and ion current decrease from the lightest to the heaviest gas except for trend-breaking higher values for Ar fluence and flux. The energy fluence, energy flux, power flow, and damage factors are relatively constant from H{sub 2} to N{sub 2} but increase for Ne, Ar, Kr and Xe due to radiative cooling and collapse effects. This paper provides much needed benchmark reference values and scaling trends for ion beams of a PF operated in any gas.

  19. Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ion Beam - Scanning Electron Microscopy

    SciTech Connect (OSTI)

    Nelson, George J.; Harris, William H.; Lombardo, Jeffrey J.; Izzo, Jr., John R.; Chiu, W. K. S.; Tanasini, Pietro; Cantoni, Marco; Van herle, Jan; Comninellis, Christos; Andrews, Joy C.; Liu, Yijin; Pianetta, Piero; Chu, Yong

    2011-03-24

    X-ray nanotomography and focused ion beam scanning electron microscopy (FIB-SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIBSEM enable elemental mapping within the microstructure. Using these methods, non-destructive 3D x-ray imaging and FIBSEM serial sectioning have been applied to compare three-dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

  20. Beam Instrumentation Workshop

    SciTech Connect (OSTI)

    Shafer, R.E. )

    1994-01-01

    The fifth annual Beam Instrumentation Workshop was hosted by Los Alamos National Laboratory in Santa Fe, New Mexico. These proceedings represent the papers presented at the Workshop. A variety of topics were covered including beam emittance diagnostics, fluorescent screens, control systems for many accelerators and photon sources. Beam monitoring was discussed in great detail. There were thirty seven papers presented at the Workshop and all have been abstracted for the Energy and Science Technology database. (AIP)

  1. Chemical Imaging Analysis of Environmental Particles Using the Focused Ion Beam/Scanning Electron Microscopy Technique: Microanalysis Insights into Atmospheric Chemistry of Fly Ash

    SciTech Connect (OSTI)

    Chen, Haihan; Grassian, Vicki H.; Saraf, Laxmikant V.; Laskin, Alexander

    2013-01-21

    Airborne fly ash from coal combustion may represent a source of bioavailable iron (Fe) in the open ocean. However, few studies have been made focusing on Fe speciation and distribution in coal fly ash. In this study, chemical imaging of fly ash has been performed using a dual-beam FIB/SEM (focused ion beam/scanning electron microscope) system for a better understanding of how simulated atmospheric processing modify the morphology, chemical compositions and element distributions of individual particles. A novel approach has been applied for cross-sectioning of fly ash specimen with a FIB in order to explore element distribution within the interior of individual particles. Our results indicate that simulated atmospheric processing causes disintegration of aluminosilicate glass, a dominant material in fly ash particles. Aluminosilicate-phase Fe in the inner core of fly ash particles is more easily mobilized compared with oxide-phase Fe present as surface aggregates on fly ash spheres. Fe release behavior depends strongly on Fe speciation in aerosol particles. The approach for preparation of cross-sectioned specimen described here opens new opportunities for particle microanalysis, particular with respect to inorganic refractive materials like fly ash and mineral dust.

  2. Towards sub-200 nm nano-structuring of linear giant magneto-resistive spin valves by a direct focused ion beam milling process

    SciTech Connect (OSTI)

    Riedmüller, Benjamin; Huber, Felix; Herr, Ulrich

    2014-02-14

    In this work, we present a detailed investigation of a focused ion beam (FIB) assisted nano-structuring process for giant magneto-resistive (GMR) spin valve sensors. We have performed a quantitative study of the dependence of the GMR ratio as well as the sensor resistance on the ion dose, which is implanted in the active region of our sensors. These findings are correlated with the decrease of magneto-resistive properties after micro- and nano-structuring by the FIB and reveal the importance of ion damage which limits the applicability of FIB milling to GMR devices in the low μm range. Deposition of a protective layer (50 nm SiO{sub 2}) on top of the sensor structure before milling leads to a preservation of the magneto-resistive properties after the milling procedure down to sensor dimensions of ∼300 nm. The reduction of the sensor dimensions to the nanometer regime is accompanied by a shift of the GMR curves, and a modification of the saturation behavior. Both effects can be explained by a micromagnetic model including the magnetic interaction of free and pinned layer as well as the effect of the demagnetizing field of the free layer on the sensor behavior. The results demonstrate that the FIB technology can be successfully used to prepare spintronic nanostructures.

  3. BEAM INSTRUMENTATION FOR HIGH POWER HADRON BEAMS

    SciTech Connect (OSTI)

    Aleksandrov, Alexander V

    2013-01-01

    This presentation will describe developments in the beam diagnostics which support the understanding and operation of high power hadron accelerators. These include the measurement of large dynamic range transverse and longitudinal beam profiles, beam loss detection, and non-interceptive diagnostics.

  4. Electron density profile measurements at a self-focusing ion beam with high current density and low energy extracted through concave electrodes

    SciTech Connect (OSTI)

    Fujiwara, Y. Nakamiya, A.; Sakakita, H.; Innovative Plasma Technologies Group, National Institute of Advanced Industrial Science and Technology , Ibaraki ; Hirano, Y.; Laboratory of Physics, College of Science and Technologies, Nihon University, Tokyo ; Kiyama, S.; Koguchi, H.

    2014-02-15

    The self-focusing phenomenon has been observed in a high current density and low energy ion beam. In order to study the mechanism of this phenomenon, a special designed double probe to measure the electron density and temperature is installed into the chamber where the high current density ion beam is injected. Electron density profile is successfully measured without the influence of the ion beam components. Estimated electron temperature and density are ?0.9 eV and ?8 10{sup 8} cm{sup ?3} at the center of ion beam cross section, respectively. It was found that a large amount of electrons are spontaneously accumulated in the ion beam line in the case of self-forcing state.

  5. LEDA BEAM DIAGNOSTICS INSTRUMENTATION: BEAM POSITION MONITORS

    SciTech Connect (OSTI)

    D. BARR; ET AL

    2000-05-01

    The Low Energy Demonstration Accelerator (LEDA) facility located at Los Alamos National Laboratory (LANL) accelerates protons to an energy of 6.7-MeV and current of 100-mA operating in either a pulsed or cw mode. Of key importance to the commissioning and operations effort is the Beam Position Monitor system (BPM). The LEDA BPM system uses five micro-stripline beam position monitors processed by log ratio processing electronics with data acquisition via a series of custom TMS32OC40 Digital Signal Processing (DSP) boards. Of special interest to this paper is the operation of the system, the log ratio processing, and the system calibration technique. This paper will also cover the DSP system operations and their interaction with the main accelerator control system.

  6. Beam instrumentation for the Tevatron Collider

    SciTech Connect (OSTI)

    Moore, Ronald S.; Jansson, Andreas; Shiltsev, Vladimir; /Fermilab

    2009-10-01

    The Tevatron in Collider Run II (2001-present) is operating with six times more bunches and many times higher beam intensities and luminosities than in Run I (1992-1995). Beam diagnostics were crucial for the machine start-up and the never-ending luminosity upgrade campaign. We present the overall picture of the Tevatron diagnostics development for Run II, outline machine needs for new instrumentation, present several notable examples that led to Tevatron performance improvements, and discuss the lessons for future colliders.

  7. Beam Instrumentation of the PXIE LEBT Beamline

    SciTech Connect (OSTI)

    D'Arcy, R.; Hanna, B.; Prost, L.; Scarpine, v.; Shemyakin, A.

    2015-06-01

    The PXIE accelerator [1] is the front-end test stand of the proposed Proton Improvement Plan (PIP-II) [2] initiative: a CW-compatible pulsed H- superconducting RF linac upgrade to Fermilab’s injection system. The PXIE Ion Source and Low-Energy Beam Transport (LEBT) section are designed to create and transfer a 1-10 mA $H^{-}$ beam, in either pulsed (0.001–16 ms) or DC mode, from the ion source through to the injection point of the RFQ. This paper discusses the range of diagnostic tools – Allison-type Emittance Scanner, Faraday Cup, Toroid, DCCT, electrically isolated diaphragms – involved in the commissioning of the beam line and preparation of the beam for injection into the RFQ.

  8. DMSE Electron Beam Instruments Facility | The Ames Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    DMSE Electron Beam Instruments Facility The DMSE E-beam facility is open to all Ames Laboratory staff, associates, ISU community and outside entities on a fee-for-service basis. Researchers can either work directly with staff to perform analysis on an as-needed basis or can be trained to use some of the general use equipment. Extensive sample preparation equipment necessary for scanning and transmission electron microscopy is available to all trained users. Authorized personnel can schedule

  9. Customized atomic force microscopy probe by focused-ion-beam...

    Office of Scientific and Technical Information (OSTI)

    Department of Pediatrics, Division of Immunology, Allergy and Rheumatology, Stanford ... OSTI Identifier: 22314503 Resource Type: Journal Article Resource Relation: Journal Name: ...

  10. The MICE Muon Beam on ISIS and the beam-line instrumentation of the Muon Ionization Cooling Experiment

    SciTech Connect (OSTI)

    Bogomilov, M.; et al.

    2012-05-01

    The international Muon Ionization Cooling Experiment (MICE), which is under construction at the Rutherford Appleton Laboratory (RAL), will demonstrate the principle of ionization cooling as a technique for the reduction of the phase-space volume occupied by a muon beam. Ionization cooling channels are required for the Neutrino Factory and the Muon Collider. MICE will evaluate in detail the performance of a single lattice cell of the Feasibility Study 2 cooling channel. The MICE Muon Beam has been constructed at the ISIS synchrotron at RAL, and in MICE Step I, it has been characterized using the MICE beam-instrumentation system. In this paper, the MICE Muon Beam and beam-line instrumentation are described. The muon rate is presented as a function of the beam loss generated by the MICE target dipping into the ISIS proton beam. For a 1 V signal from the ISIS beam-loss monitors downstream of our target we obtain a 30 KHz instantaneous muon rate, with a neglible pion contamination in the beam.

  11. Experience with the ground test accelerator beam-measurement instrumentation

    SciTech Connect (OSTI)

    Gilpatrick, J.D.; Johnson, K.F.; Connolly, R.C.; Power, J.F.; Rose, C.R.; Sander, O.R.; Shafer, R.E.; Sandoval, D.P.; Yuan, V.W. )

    1994-10-10

    During the past two years, the Ground Test Accelerator (GTA) has used a variety of off- and on-line beam diagnostic measurements to understand and verify the transverse and longitudinal phase space characteristics of a 35-mA, low-energy (2.5- to 3.2-MeV) H[sup [minus

  12. Deposition of metallic gallium on re-crystallized ceramic material during focused ion beam milling

    SciTech Connect (OSTI)

    Muoz-Tabares, J.A.; Reyes-Gasga, J.

    2013-12-15

    We report a new kind of artifact observed in the preparation of a TEM sample of zirconia by FIB, which consists in the deposition of metallic gallium nano-dots on the TEM sample surface. High resolution TEM images showed a microstructure of fine equiaxed grains of ? 5 nm, with some of them possessing two particular characteristics: high contrast and well-defined fast Fourier transform. These grains could not be identified as any phase of zirconia but it was possible to identify them as gallium crystals in the zone axis [110]. Based on HRTEM simulations, the possible orientations between zirconia substrate and deposited gallium are discussed in terms of lattice mismatch and oxygen affinity. - Highlights: We show a new type of artifact induced during preparation of TEM samples by FIB. Deposition of Ga occurs due to its high affinity for oxygen. Materials with small grain size (? 5 nm) could promote Ga deposition. Small grain size permits the elastic accommodation of deposited Ga.

  13. Instrumentation and Beam Dynamics Study of Advanced Electron-Photon Facility in Indiana University

    SciTech Connect (OSTI)

    Luo, Tianhuan; /Indiana U.

    2011-08-01

    The Advanced eLectron-PHoton fAcility (ALPHA) is a compact electron accelerator under construction and being commissioned at the Indiana University Center for Exploration of Energy and Matter (CEEM). In this thesis, we have studied the refurbished Cooler Injector Synchrotron (CIS) RF cavity using both the transmission line model and SUPERFISH simulation. Both low power and high power RF measurements have been carried out to characterize the cavity. Considering the performance limit of ferrite, we have designed a new ferrite loaded, co-axial quarter wave like cavity with similar structure but a more suitable ferrite material. We have also designed a traveling wave stripline kicker for fast extraction by POISSON and Microwave Studio. The strips geometry is trimmed to maximize the uniformity of the kicking field and match the impedance of the power cables. The time response simulation shows the kicker is fast enough for machine operation. The pulsed power supply requirement has also been specified. For the beam diagnosis in the longitudinal direction, we use a wideband Wall Gap Monitor (WGM) served in CIS. With proper shielding and amplification to get good WGM signal, we have characterized the injected and extracted beam signal in single pass commissioning, and also verified the debunching effect of the ALPHA storage ring. A modulation-demodulation signal processing method is developed to measure the current and longitudinal profile of injected beam. By scanning the dipole strength in the injection line, we have reconstructed the tomography of the longitudinal phase space of the LINAC beam. In the accumulation mode, ALPHA will be operated under a low energy and high current condition, where intra beam scattering (IBS) becomes a dominant effect on the beam emittance. A self consistent simulation, including IBS effect, gas scattering and linear coupling, has been carried out to calculate the emittance of the stored beam.

  14. 3D characterization of intermetallics in a high pressure die cast Mg alloy using focused ion beam tomography

    SciTech Connect (OSTI)

    Nagasekhar, A.V. [ARC Centre of Excellence for Design in Light Metals, Materials Engineering, University of Queensland, Brisbane, QLD 4072 (Australia); Caceres, C.H., E-mail: c.caceres@uq.edu.au [ARC Centre of Excellence for Design in Light Metals, Materials Engineering, University of Queensland, Brisbane, QLD 4072 (Australia); Kong, C. [Electron Microscope Unit, UNSW Analytical Centre, University of New South Wales, Sydney, NSW 2052 (Australia)

    2010-11-15

    The degree of spatial interconnection of the Mg{sub 17}Al{sub 12} ({beta}-phase) intermetallic in a Mg-9Al-1Zn alloy was assessed through serial sectioning at the centre and near a corner in a casting cross-section. The three dimensional reconstructions showed that the intermetallics were profusely interconnected forming a scaffold-like network over the entire cross-section, but especially near the casting surface. The scale and degree of the interconnection appeared determined by the local concentration of large dendritic grains injected from the shot sleeve. The volume fractions of intermetallics obtained through the 3D reconstruction indicated a higher content of {beta}-phase at the corner regions in comparison with the core. The volume fractions obtained by FIB were consistent with theoretical and experimental values obtained using other techniques.

  15. Precision laser surveying instrument using atmospheric turbulence compensation by determining the absolute displacement between two laser beam components

    DOE Patents [OSTI]

    Veligdan, James T.

    1993-01-01

    Atmospheric effects on sighting measurements are compensated for by adjusting any sighting measurements using a correction factor that does not depend on atmospheric state conditions such as temperature, pressure, density or turbulence. The correction factor is accurately determined using a precisely measured physical separation between two color components of a light beam (or beams) that has been generated using either a two-color laser or two lasers that project different colored beams. The physical separation is precisely measured by fixing the position of a short beam pulse and measuring the physical separation between the two fixed-in-position components of the beam. This precisely measured physical separation is then used in a relationship that includes the indexes of refraction for each of the two colors of the laser beam in the atmosphere through which the beam is projected, thereby to determine the absolute displacement of one wavelength component of the laser beam from a straight line of sight for that projected component of the beam. This absolute displacement is useful to correct optical measurements, such as those developed in surveying measurements that are made in a test area that includes the same dispersion effects of the atmosphere on the optical measurements. The means and method of the invention are suitable for use with either single-ended systems or a double-ended systems.

  16. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsAerosols

  17. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsOther

  18. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsRadiometric

  19. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsAirborne Observations

  20. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsCloud Properties

  1. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsOcean Observations

  2. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsSatellite Observations

  3. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsSurface Meteorology

  4. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsDerived Quantities and Models

  5. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsSurface/Subsurface Properties

  6. Ion beam processing of advanced electronic materials

    SciTech Connect (OSTI)

    Cheung, N.W.; Marwick, A.D.; Roberto, J.B. (eds.) (California Univ., Berkeley, CA (USA); International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center; Oak Ridge National Lab., TN (USA))

    1989-01-01

    This report contains research programs discussed at the materials research society symposia on ion beam processing of advanced electronic materials. Major topics include: shallow implantation and solid-phase epitaxy; damage effects; focused ion beams; MeV implantation; high-dose implantation; implantation in III-V materials and multilayers; and implantation in electronic materials. Individual projects are processed separately for the data bases. (CBS)

  7. Highly efficient electron vortex beams generated by nanofabricated phase holograms

    SciTech Connect (OSTI)

    Grillo, Vincenzo; Mafakheri, Erfan; Frabboni, Stefano

    2014-01-27

    We propose an improved type of holographic-plate suitable for the shaping of electron beams. The plate is fabricated by a focused ion beam on a silicon nitride membrane and introduces a controllable phase shift to the electron wavefunction. We adopted the optimal blazed-profile design for the phase hologram, which results in the generation of highly efficient (25%) electron vortex beams. This approach paves the route towards applications in nano-scale imaging and materials science.

  8. ARM - Instrument - pass

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentspass Documentation PASS : Handbook ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Photoacoustic Soot Spectrometer (PASS) Instrument Categories Aerosols General Overview The photoacoustic soot spectrometer (PASS) measures light absorption by aerosol particles. As the particles pass through a laser beam, the absorbed energy heats the particles and in turn the surrounding air, which sets off

  9. Instrumentation and Controls, IC, Accelerator Operations and...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instrumentation and Controls, IC About Us AOT Home Teams Beam Diagnostics Controls Software ECAD Electronics Vacuum CONTACTS Group Leader Fred E. Shelley Office Administrator...

  10. Focused electron and ion beam systems

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Reijonen, Jani; Persaud, Arun; Ji, Qing; Jiang, Ximan

    2004-07-27

    An electron beam system is based on a plasma generator in a plasma ion source with an accelerator column. The electrons are extracted from a plasma cathode in a plasma ion source, e.g. a multicusp plasma ion source. The beam can be scanned in both the x and y directions, and the system can be operated with multiple beamlets. A compact focused ion or electron beam system has a plasma ion source and an all-electrostatic beam acceleration and focusing column. The ion source is a small chamber with the plasma produced by radio-frequency (RF) induction discharge. The RF antenna is wound outside the chamber and connected to an RF supply. Ions or electrons can be extracted from the source. A multi-beam system has several sources of different species and an electron beam source.

  11. Beam Status

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beam Status Beam Status Print Loading... You can also view the Operations Group's Beam History archives.

  12. LANSCE | Lujan Center | Instruments | PCS

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Protein Crystallography Station | PCS Structural Enzymology The Protein Crystallography Station (PCS) at LANSCE is a high performance beam line that is funded by DOE-OBER. It forms the core of a capability for joint neutron and X-ray macromolecular structure and function determination. The PCS is the first protein crystallography beam line to be built at a spallation neutron source in North America and is one of the world's premier neutron crystallography instruments. The beam-line exploits the

  13. ARM - Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instruments Related Links RHUBC Home NSA Home ARM Data Discovery Browse Data Experiment Planning RHUBC Proposal Abstract Full Proposal (pdf, 420kb) Science Plan (pdf) Operations ...

  14. ARM - Instrument -

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    radar line up at the SGP site Instrument collections* at three fixed sites around the globe, two mobile facilities, and an aerial facility are operated by the ARM Climate...

  15. Beam Status

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beam Status Print Loading... You can also view the Operations Group's Beam History archives

  16. Summary of the 2014 Beam-Halo Monitoring Workshop (Conference...

    Office of Scientific and Technical Information (OSTI)

    Resource Relation: Conference: InvitedInternational Beam Instrumentation Conference 2015, Melbourne, Australia, 9142015-9172015 Research Org: SLAC National Accelerator ...

  17. Neutron instrumentation for biology

    SciTech Connect (OSTI)

    Mason, S.A.

    1994-12-31

    In the October 1994 round of proposals at the ILL, the external biology review sub- committee was asked to allocate neutron beam time to a wide range of experiments, on almost half the total number of scheduled neutron instruments: on 3 diffractometers, on 3 small angle scattering instruments, and on some 6 inelastic scattering spectrometers. In the 3.5 years since the temporary reactor shutdown, the ILL`s management structure has been optimized, budgets and staff have been trimmed, the ILL reactor has been re-built, and many of the instruments up-graded, many powerful (mainly Unix) workstations have been introduced, and the neighboring European Synchrotron Radiation Facility has established itself as the leading synchrotron radiation source and has started its official user program. The ILL reactor remains the world`s most intense dedicated neutron source. In this challenging context, it is of interest to review briefly the park of ILL instruments used to study the structure and energetics of small and large biological systems. A brief summary will be made of each class of experiments actually proposed in the latest ILL proposal round.

  18. ARM - Instrument - mettwr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instrument : Surface and Tower Meteorological Instrumentation at NSA (METTWR) Instrument ... Surface and Tower Meteorological Instrumentation at NSA (METTWR) use mainly conventional ...

  19. ARM - Instrument - om

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instrument : Ozone Monitoring Instrument (OM) <-- Picture of the Ozone Monitoring Instrument (OMI) --> General Overview The Ozone Monitoring Instrument (OMI) distinguishes between ...

  20. Beam-beam simulations for separated beams

    SciTech Connect (OSTI)

    Furman, Miguel A.

    2000-04-10

    We present beam-beam simulation results from a strong-strong gaussian code for separated beams for the LHC and RHIC. The frequency spectrum produced by the beam-beam collisions is readily obtained and offers a good opportunity for experimental comparisons. Although our results for the emittance blowup are preliminary, we conclude that, for nominal parameter values, there is no significant difference between separated beams and center-on-center collisions.

  1. Beam director design report

    SciTech Connect (OSTI)

    Younger, F.C.

    1986-08-01

    A design and fabrication effort for a beam director is documented. The conceptual design provides for the beam to pass first through a bending and focusing system (or ''achromat''), through a second achromat, through an air-to-vacuum interface (the ''beam window''), and finally through the vernier steering system. Following an initial concept study for a beam director, a prototype permanent magnet 30/sup 0/ beam-bending achromat and prototype vernier steering magnet were designed and built. In volume II, copies are included of the funding instruments, requests for quotations, purchase orders, a complete set of as-built drawings, magnetic measurement reports, the concept design report, and the final report on the design and fabrication project. (LEW)

  2. Co: clqrt. Beam

    Office of Legacy Management (LM)

    Co: clqrt. Beam*/:

  3. First Beam Waist Measurements in the Final Focus Beam Line at...

    Office of Scientific and Technical Information (OSTI)

    to the design, to limit effects from higher-order optical aberrations and hence simplify beam tuning procedures while key instrumentation was being tested and calibrated. ...

  4. Tevatron instrumentation: boosting collider performance

    SciTech Connect (OSTI)

    Shiltsev, Vladimir; Jansson, Andreas; Moore, Ronald; /Fermilab

    2006-05-01

    The Tevatron in Collider Run II (2001-present) is operating with six times more bunches, many times higher beam intensities and luminosities than in Run I (1992-1995). Beam diagnostics were crucial for the machine start-up and the never-ending luminosity upgrade campaign. We present the overall picture of the Tevatron diagnostics development for Run II, outline machine needs for new instrumentation, present several notable examples that led to Tevatron performance improvements, and discuss the lessons for the next big machines--LHC and ILC.

  5. ARM - Instrument - prp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instrument Categories Radiometric The Portable Radiation Package (PRP) is an instrument suite to collect atmospheric radiation measurements on a moving platform. The instrument ...

  6. ARM - Instrument - omi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsomi Documentation OMI : XDC documentation ARM Data Discovery Browse Data ... Send Instrument : Ozone Monitoring Instrument (OMI) Instrument Categories Satellite ...

  7. ARM - Campaign Instrument - ecmwfdiag

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Send Campaign Instrument : European Centre for Medium Range Weather Forecasts Diagnostic Analyses (ECMWFDIAG) Instrument Categories Derived Quantities and Models Campaigns...

  8. Ion-beam apparatus and method for analyzing and controlling integrated circuits

    DOE Patents [OSTI]

    Campbell, A.N.; Soden, J.M.

    1998-12-01

    An ion-beam apparatus and method for analyzing and controlling integrated circuits are disclosed. The ion-beam apparatus comprises a stage for holding one or more integrated circuits (ICs); a source means for producing a focused ion beam; and a beam-directing means for directing the focused ion beam to irradiate a predetermined portion of the IC for sufficient time to provide an ion-beam-generated electrical input signal to a predetermined element of the IC. The apparatus and method have applications to failure analysis and developmental analysis of ICs and permit an alteration, control, or programming of logic states or device parameters within the IC either separate from or in combination with applied electrical stimulus to the IC for analysis thereof. Preferred embodiments of the present invention including a secondary particle detector and an electron floodgun further permit imaging of the IC by secondary ions or electrons, and allow at least a partial removal or erasure of the ion-beam-generated electrical input signal. 4 figs.

  9. Ion-beam apparatus and method for analyzing and controlling integrated circuits

    DOE Patents [OSTI]

    Campbell, Ann N.; Soden, Jerry M.

    1998-01-01

    An ion-beam apparatus and method for analyzing and controlling integrated circuits. The ion-beam apparatus comprises a stage for holding one or more integrated circuits (ICs); a source means for producing a focused ion beam; and a beam-directing means for directing the focused ion beam to irradiate a predetermined portion of the IC for sufficient time to provide an ion-beam-generated electrical input signal to a predetermined element of the IC. The apparatus and method have applications to failure analysis and developmental analysis of ICs and permit an alteration, control, or programming of logic states or device parameters within the IC either separate from or in combination with applied electrical stimulus to the IC for analysis thereof. Preferred embodiments of the present invention including a secondary particle detector and an electron floodgun further permit imaging of the IC by secondary ions or electrons, and allow at least a partial removal or erasure of the ion-beam-generated electrical input signal.

  10. Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Auden, Elizabeth C.; Pacheco, Jose L.; Bielejec, Edward; Vizkelethy, Gyorgy; Abraham, John B. S.; Doyle, Barney L.

    2015-12-01

    In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si++ ions and 60 keV Li+ ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

  11. Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

    SciTech Connect (OSTI)

    Auden, Elizabeth C.; Pacheco, Jose L.; Bielejec, Edward; Vizkelethy, Gyorgy; Abraham, John B. S.; Doyle, Barney L.

    2015-12-01

    In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si++ ions and 60 keV Li+ ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

  12. Beam Transport

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beam Transport A simplified drawing of the beam transport system from the linac to Target-1 (Lujan Center), Target-2 (Blue Room) and Target-4 is shown below. In usual operation ...

  13. ARM - Instrument - htdma

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Humidified Tandem Differential Mobility Analyzer (HTDMA) Instrument Categories Aerosols This instrument...

  14. Low activated incore instrument

    DOE Patents [OSTI]

    Ekeroth, Douglas E.

    1994-01-01

    Instrumentation for nuclear reactor head-mounted incore instrumentation systems fabricated of low nuclear cross section materials (i.e., zirconium or titanium). The instrumentation emits less radiation than that fabricated of conventional materials.

  15. Low activated incore instrument

    DOE Patents [OSTI]

    Ekeroth, D.E.

    1994-04-19

    Instrumentation is described for nuclear reactor head-mounted incore instrumentation systems fabricated of low nuclear cross section materials (i.e., zirconium or titanium). The instrumentation emits less radiation than that fabricated of conventional materials. 9 figures.

  16. Superconductive silicon nanowires using gallium beam lithography.

    SciTech Connect (OSTI)

    Henry, Michael David; Jarecki, Robert Leo,

    2014-01-01

    This work was an early career LDRD investigating the idea of using a focused ion beam (FIB) to implant Ga into silicon to create embedded nanowires and/or fully suspended nanowires. The embedded Ga nanowires demonstrated electrical resistivity of 5 m-cm, conductivity down to 4 K, and acts as an Ohmic silicon contact. The suspended nanowires achieved dimensions down to 20 nm x 30 nm x 10 m with large sensitivity to pressure. These structures then performed well as Pirani gauges. Sputtered niobium was also developed in this research for use as a superconductive coating on the nanowire. Oxidation characteristics of Nb were detailed and a technique to place the Nb under tensile stress resulted in the Nb resisting bulk atmospheric oxidation for up to years.

  17. Graphene engineering by neon ion beams

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V.; Joy, David C.; Rondinone, Adam J.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-02-18

    Achieving the ultimate limits of materials and device performance necessitates the engineering of matter with atomic, molecular, and mesoscale fidelity. While common for organic and macromolecular chemistry, these capabilities are virtually absent for 2D materials. In contrast to the undesired effect of ion implantation from focused ion beam (FIB) lithography with gallium ions, and proximity effects in standard e-beam lithography techniques, the shorter mean free path and interaction volumes of helium and neon ions offer a new route for clean, resist free nanofabrication. Furthermore, with the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of graphenemore » based nanoelectronics is coming to the forefront. Here, we will discuss the use of energetic Ne ions in engineering graphene devices and explore the mechanical, electromechanical and chemical properties of the ion-milled devices using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we demonstrate that the mechanical, electrical and optical properties of the exact same devices can be quantitatively extracted. Additionally, the effect of defects inherent in ion beam direct-write lithography, on the overall performance of the fabricated devices is elucidated.« less

  18. ARM - RHUBC II Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instruments Related Links RHUBC-II Home RHUBC Home ARM Field Campaigns Home ARM Data Discovery Browse Data Deployment Instruments Science Team RHUBC-II Wiki Site Tour News RHUBC-II Backgrounder (PDF, 300K) News & Press Images Experiment Planning RHUBC-II Proposal Abstract Science Plan (PDF, 267KB) Science Objectives Contacts Eli Mlawer, Principal Investigator Dave Turner, Principal Investigator RHUBC II Instruments RHUBC-II Instruments - Cerro Toco, Chile Guest Instruments Instrument

  19. ARM - Site Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    FacilityInstruments AAF Information Proposal Process Baseline Instruments Campaign Instruments AAF Fact Sheet G-1 Fact Sheet Images Science Airborne Instrumentation Needs for Climate and Atmospheric Research The DOE ARM Aerial Facility Field Campaigns AAF Campaigns 2007 - UAV Campaigns 1993 - 2006, 2015 Other Aircraft Campaigns 1993 - 2010 AAF Contacts Rickey Petty DOE AAF Program Director Beat Schmid Technical Director AAF Baseline Instruments The following instruments represent available

  20. ARM - Instrument - swats

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1-888-ARM-DATA. Send Instrument : Soil Water and Temperature System (SWATS) Instrument Categories SurfaceSubsurface Properties Picture of the Soil Water and Temperature System ...

  1. ARM - Instrument - clap

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    us a note below or call us at 1-888-ARM-DATA. Send Instrument : Continuous Light Absorption Photometer (CLAP) Instrument Categories Aerosols The Continuous Light Absorption...

  2. Evaluating musical instruments

    SciTech Connect (OSTI)

    Campbell, D. Murray

    2014-04-01

    Scientific measurements of sound generation and radiation by musical instruments are surprisingly hard to correlate with the subtle and complex judgments of instrumental quality made by expert musicians.

  3. WNR Instrument Contacts

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instrument Contacts Name Flight Path Position Phone Pager Cell Ullmann, John 1FP14(DANCE) Instrument Scientist 667-2517 664-3523 Couture, Aaron 1FP14(DANCE) Instrument Assistant 667-1730 664-1163 Mosby, Shea 1FP14(DANCE) Instrument Assistant 665-5414 664-7412 Tovesson, Fredrik 1FP12 Instrument Assistant 665-9652 500-5073 Vogel, Sven 1FP05 Instrument Scientist 667-7016 412-7547 Nelson, Ron 1FP05 Instrument Scientist 667-7107 664-2191 690-4220 Devlin, Matt 4FP15L(Chi-Nu) Instrument Scientist

  4. ARM - Campaign Instrument - pdi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Phase Doppler Interferometer (PDI) Instrument Categories Airborne Observations, Cloud Properties...

  5. ARM - Site Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Point Reyes National Seashore, CaliforniaInstruments Point Reyes Deployment AMF Home Point Reyes Home Data Plots and Baseline Instruments Experiment Planning MASRAD Proposal...

  6. ARM - Site Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2009-2010 Shouxian, China, 2008 Black Forest, Germany, 2007 Niamey, Niger, 2006 Point Reyes, California, 2005 Instruments : Gan Island, Maldives Active Retired Active instruments...

  7. ARM - Instrument - ecmwfdiag

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1-888-ARM-DATA. Send Instrument : European Centre for Medium Range Weather Forecasts Diagnostic Analyses (ECMWFDIAG) Instrument Categories Derived Quantities and Models General...

  8. ARM - Campaign Instrument - psr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    call us at 1-888-ARM-DATA. Send Campaign Instrument : Polarimetric Scanning Radiometer (PSR) Instrument Categories Radiometric, Surface Meteorology Campaigns Cloud LAnd Surface...

  9. ARM - Campaign Instrument - twst

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1-888-ARM-DATA. Send Campaign Instrument : Three Waveband Spectrally-agile Technique Sensor (TWST) Instrument Categories Atmospheric Profiling, Cloud Properties, Radiometric...

  10. ARM - Instrument - usdarad

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    us a note below or call us at 1-888-ARM-DATA. Send Instrument : US Department of Agriculture (USDA) Radiation Monitoring Data (USDARAD) Instrument Categories Radiometric...

  11. ARM - Campaign Instrument - sam

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    or call us at 1-888-ARM-DATA. Send Campaign Instrument : Sun and Aureole Measurement (SAM) Instrument Categories Radiometric Campaigns CLASIC - SAM Support Download Data ...

  12. ARM - Site Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    for Guest Scientists Contacts Instruments : Intermediate Facilities Active Retired Active instruments are currently deployed at fixed or mobile facilities or are available through...

  13. ARM - Instrument - rwp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    us at 1-888-ARM-DATA. Send Instrument : Radar Wind Profiler (RWP) Instrument Categories Atmospheric Profiling General Overview The radar wind profilerradio acoustic sounding ...

  14. ARM - Campaign Instrument - rcs

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    at 1-888-ARM-DATA. Send Campaign Instrument : NREL Radiometer Characterization System (RCS) Instrument Categories Radiometric Campaigns Aerosol IOP Download Data Southern...

  15. ARM - Campaign Instrument - mas

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    below or call us at 1-888-ARM-DATA. Send Campaign Instrument : NASA MODIS Airborne Simulator (MAS) Instrument Categories Airborne Observations, Radiometric Campaigns Cloud LAnd...

  16. ARM - Campaign Instrument - mir

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    us at 1-888-ARM-DATA. Send Campaign Instrument : Millimeter-wave Imaging Radiometer (MIR) Instrument Categories Atmospheric Profiling, Radiometric Campaigns Millimeter-wave...

  17. ARM - Guest Instrument Facility

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    features a climate-controlled main building, an elevated instrument platform, and a concrete instrument patio, all of which are described in more detail below. Features Features...

  18. Photoacoustic Soot Spectrometer (PASS) Instrument Handbook

    SciTech Connect (OSTI)

    Dubey, M; Springston, S; Koontz, A; Aiken, A

    2013-01-17

    The photoacoustic soot spectrometer (PASS) measures light absorption by aerosol particles. As the particles pass through a laser beam, the absorbed energy heats the particles and in turn the surrounding air, which sets off a pressure wave that can be detected by a microphone. The PASS instruments deployed by ARM can also simultaneously measure the scattered laser light at three wavelengths and therefore provide a direct measure of the single-scattering albedo. The Operator Manual for the PASS-3100 is included here with the permission of Droplet Measurement Technologies, the instruments manufacturer.

  19. Particle size distribution instrument. Topical report 13

    SciTech Connect (OSTI)

    Okhuysen, W.; Gassaway, J.D.

    1995-04-01

    The development of an instrument to measure the concentration of particles in gas is described in this report. An in situ instrument was designed and constructed which sizes individual particles and counts the number of occurrences for several size classes. Although this instrument was designed to detect the size distribution of slag and seed particles generated at an experimental coal-fired magnetohydrodynamic power facility, it can be used as a nonintrusive diagnostic tool for other hostile industrial processes involving the formation and growth of particulates. Two of the techniques developed are extensions of the widely used crossed beam velocimeter, providing simultaneous measurement of the size distribution and velocity of articles.

  20. Laser beam centering and pointing system

    DOE Patents [OSTI]

    Rushford, Michael Charles

    2015-01-13

    An optical instrument aligns an optical beam without the need for physical intervention of the instrument within the apparatus or platforms from which the trajectory of the beam to be ascertained. The alignment apparatus and method enable the desired function to be realized without the placement of physical apertures or sensors directly in the path of the beam through the system whose spatial position and slope is to be sought. An image plane provides the observer with a pair of well-defined images that are indicative of the beam centering and pointing alignment parameters. The optical alignment can be realized without the need for referencing to an external or fixed set of coordinates or fiducials. The instrument can therefore service situations where adverse environments would otherwise prohibit the use of such instruments, including regions of high radiation, high temperature, vacuum and/or cryogenic atmospheres.

  1. Career Map: Instrumentation Coordinator

    Office of Energy Efficiency and Renewable Energy (EERE)

    The Wind Program's Career Map provides job description information for Instrumentation Coordinator positions.

  2. ICFA Beam Dynamics Newsletter

    SciTech Connect (OSTI)

    Ben-Zvi I.; Kuczewski A.; Altinbas, Z.; Beavis, D.; Belomestnykh,; Dai, J. et al

    2012-07-01

    The Collider-Accelerator Department at Brookhaven National Laboratory is building a high-brightness 500 mA capable Energy Recovery Linac (ERL) as one of its main R&D thrusts towards eRHIC, the polarized electron - hadron collider as an upgrade of the operating RHIC facility. The ERL is in final assembly stages, with injection commisioning starting in October 2012. The objective of this ERL is to serve as a platform for R&D into high current ERL, in particular issues of halo generation and control, Higher-Order Mode (HOM) issues, coherent emissions for the beam and high-brightness, high-power beam generation and preservation. The R&D ERL features a superconducting laser-photocathode RF gun with a high quantum efficiency photoccathode served with a load-lock cathode delivery system, a highly damped 5-cell accelerating cavity, a highly flexible single-pass loop and a comprehensive system of beam instrumentation. In this ICFA Beam Dynamics Newsletter article we will describe the ERL in a degree of detail that is not usually found in regular publications. We will discuss the various systems of the ERL, following the electrons from the photocathode to the beam dump, cover the control system, machine protection etc and summarize with the status of the ERL systems.

  3. ARM - Instrumentation Workshop 2008

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    FacilityInstrumentation Workshop 2008 AAF Information Proposal Process Baseline Instruments Campaign Instruments AAF Fact Sheet G-1 Fact Sheet Images Science Airborne Instrumentation Needs for Climate and Atmospheric Research The DOE ARM Aerial Facility Field Campaigns AAF Campaigns 2007 - UAV Campaigns 1993 - 2006, 2015 Other Aircraft Campaigns 1993 - 2010 AAF Contacts Rickey Petty DOE AAF Program Director Beat Schmid Technical Director Instrumentation Workshop 2008 Agenda and Presentations

  4. BEAM PROPAGATOR

    Energy Science and Technology Software Center (OSTI)

    003691MLTPL00 Beam Propagator for Weather Radars, Modules 1 and 2 http://www.exelisvis.com/ProductsServices/IDL.aspx

  5. Beam History

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beam Status Beam History Print Beamline History Request Form To request a beam current histograph from the ALS storage ring beam histograph database, select the year, month, and day, then click on "Submit Request". Histographs are available as far back as February 2, 1994. Year 2016 2015 2014 2013 2012 2011 2010 2009 2008 2007 2006 2005 2004 2003 2002 2001 2000 1999 1998 1997 1996 1995 1994 Month Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Day 01 02 03 04 05 06 07 08 09 10 11 12 13

  6. ARM - Instrument - dl

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Doppler Lidar (DL) Instrument Categories Cloud Properties Picture of the Doppler Lidar...

  7. ARM - Instrument - okm

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Oklahoma Mesonet (OKM) Instrument Categories Surface Meteorology General Overview The State of Oklahoma restricts ...

  8. ARM - Instrument - skyrad

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Sky Radiometers on Stand for Downwelling Radiation (SKYRAD) Instrument Categories...

  9. ARM - Instrument - tsi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Total Sky Imager (TSI) Instrument Categories Cloud Properties Picture of the Total Sky Imager...

  10. ARM - Instrument - ebbr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Energy Balance Bowen Ratio Station (EBBR) Instrument Categories SurfaceSubsurface...

  11. ARM - Campaign Instrument - soil

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Soil Measurement from the SGP (SOIL) Instrument Categories SurfaceSubsurface Properties Campaigns ...

  12. ARM - Instrument - soil

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Soil Measurement from the SGP (SOIL) Instrument Categories SurfaceSubsurface ...

  13. ARM - Instrument - psap

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Particle Soot Absorption Photometer (PSAP) Instrument Categories Aerosols A particle soot absorption...

  14. ARM - Instrument - tdma

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Tandem Differential Mobility Analyzer (TDMA) Instrument Categories Aerosols Picture of the...

  15. ARM - Instrument - irsi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Infra-Red Sky Imager (IRSI) Instrument Categories Cloud Properties, Radiometric Primary...

  16. ARM - Campaign Instrument - fssp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Forward-Scatter Spectrometer Probe (FSSP) Instrument Categories...

  17. ARM - Campaign Instrument - mpl

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Micropulse Lidar (MPL) Instrument Categories Cloud Properties Campaigns...

  18. ARM - Campaign Instrument - trac

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Time Resolved Aerosol Collector (TRAC) Instrument Categories Aerosols...

  19. ARM - Campaign Instrument - partimg

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Particle imager (PARTIMG) Instrument Categories Airborne Observations,...

  20. ARM - Campaign Instrument - aos

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Aerosol Observing System (AOS) Instrument Categories Aerosols Campaigns...

  1. ARM - Campaign Instrument - varanal

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Constrained Variational Analysis (VARANAL) Instrument Categories Derived...

  2. ARM - Campaign Instrument - ccn

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Cloud Condensation Nuclei Particle Counter (CCN) Instrument Categories...

  3. ARM - Campaign Instrument - cfdc

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Continuous Flow Ice Thermal Diffusion Chamber (CFDC) Instrument...

  4. ARM - Campaign Instrument - aeri

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Atmospheric Emitted Radiance Interferometer (AERI) Instrument Categories...

  5. ARM - Campaign Instrument - mfrsr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Multifilter Rotating Shadowband Radiometer (MFRSR) Instrument Categories...

  6. ARM - Campaign Instrument - sodar

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Mini Sound Detection and Ranging (SODAR) Instrument Categories...

  7. ARM - Campaign Instrument - tdma

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Tandem Differential Mobility Analyzer (TDMA) Instrument Categories...

  8. ARM - Campaign Instrument - flask

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Flask Samplers for Carbon Cycle Gases and Isotopes (FLASK) Instrument...

  9. ARM - Campaign Instrument - pcasp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Passive Cavity Aerosol Spectrometer (PCASP) Instrument Categories...

  10. ARM - Campaign Instrument - cas

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Cloud and Aerosol Spectrometer (CAS) Instrument Categories Aerosols,...

  11. ARM - Campaign Instrument - smps

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Scanning mobility particle sizer (SMPS) Instrument Categories Aerosols...

  12. ARM - Campaign Instrument - mwr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Microwave Radiometer (MWR) Instrument Categories Atmospheric Profiling,...

  13. ARM - Campaign Instrument - cep

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Cloud Extinction Probe (CEP) Instrument Categories Airborne...

  14. ARM - Campaign Instrument - nephelometer

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Nephelometer (NEPHELOMETER) Instrument Categories Aerosols Campaigns...

  15. ARM - Campaign Instrument - semsamp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Scanning Electron Microscope Sampler (SEMSAMP) Instrument Categories...

  16. ARM - Campaign Instrument - tracegas

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Trace gas concentrations (TRACEGAS) Instrument Categories Aerosols,...

  17. ARM - Campaign Instrument - cldaerosmicro

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Cloud and Aerosol Microphysical Properties (CLDAEROSMICRO) Instrument...

  18. ARM - Campaign Instrument - acsm

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Aerosol Chemical Speciation Monitor (ACSM) Instrument Categories...

  19. ARM - Campaign Instrument - dma

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Differential Mobility Analyzer (DMA) Instrument Categories Aerosols,...

  20. ARM - Campaign Instrument - gcms

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Gas Chromatography Mass Spectrometry (GCMS) Instrument Categories...

  1. ARM - Campaign Instrument - aeth

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Aethalometer (AETH) Instrument Categories Aerosols Campaigns Azores:...

  2. ARM - Campaign Instrument - disdrometer

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Impact Disdrometer (DISDROMETER) Instrument Categories Surface...

  3. ARM - Campaign Instrument - tsi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Total Sky Imager (TSI) Instrument Categories Cloud Properties Campaigns 2007 Cumulus Humilis Aerosol Process...

  4. ARM - Campaign Instrument - irsi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Infra-Red Sky Imager (IRSI) Instrument Categories Cloud Properties, ...

  5. ARM - Site Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    (PDF, 1.4MB) News Education Flyer (PDF, 2.1MB) AMF Poster, 2011 Images Contacts V. Rao Kotamarthi Instruments : Ganges Valley, India Active Retired Active instruments are...

  6. ARM - Campaign Instrument - maeri

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsmaeri Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Marine AERI (MAERI) Instrument...

  7. ARM - Campaign Instrument - aot

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsaot Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Aerosol Optical Thickness (AOT) Instrument...

  8. ARM - Campaign Instrument - hsi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentshsi Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Hemispheric Sky Imager (HSI) Instrument...

  9. ARM - Campaign Instrument - ozone

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsozone Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Ozone Monitor (OZONE) Instrument...

  10. ARM - Campaign Instrument - wsi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentswsi Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Whole Sky Imager (WSI) Instrument...

  11. ARM - Campaign Instrument - gerbprobe

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsgerbprobe Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Gerber Probe (GERBPROBE) Instrument...

  12. ARM - Campaign Instrument - mwrret

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsmwrret Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : MWR Retrievals (MWRRET) Instrument...

  13. ARM - Campaign Instrument - cpi

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentscpi Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Cloud Particle Imager (CPI) Instrument...

  14. ARM - Campaign Instrument - radon

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsradon Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Radon (RADON) Instrument Categories...

  15. ARM - Campaign Instrument - wcm

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentswcm Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : water content meter (WCM) Instrument...

  16. ARM - Campaign Instrument - sfcflux

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentssfcflux Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Surface Flux (SFCFLUX) Instrument...

  17. ARM - Campaign Instrument - learjet

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentslearjet Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Lear Jet (LEARJET) Instrument...

  18. ARM - Campaign Instrument - eta

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentseta Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Eta Model Runs (ETA) Instrument Categories...

  19. ARM - Campaign Instrument - anemometer

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsanemometer Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Anemometer (ANEMOMETER) Instrument...

  20. ARM - Campaign Instrument - aerinf

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsaerinf Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : AERI Noise Filtered (AERINF) Instrument...

  1. ARM - Campaign Instrument - mfr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsmfr Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Multifilter Radiometer (MFR) Instrument...

  2. ARM - Campaign Instrument - cmh

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentscmh Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Chilled Mirror Hygrometer (CMH) Instrument...

  3. ARM - Instrument - masc

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Multi-Angle Snowflake Camera (MASC) Instrument Categories Surface Meteorology Contact(s) Martin...

  4. ARM - Instrument - tps

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    us a note below or call us at 1-888-ARM-DATA. Send Instrument : Total Precipitation Sensor (TPS) Instrument Categories Surface Meteorology Picture of the Total Precipitation...

  5. ARM - Campaign Instrument - asti

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Absolute Solar Transmittance Interferometer (ASTI) Instrument ...

  6. ARM - Instrument - sirs

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Solar and Infrared Radiation Station (SIRS) Instrument Categories Radiometric ...

  7. ARM - Instrument - asti

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Absolute Solar Transmittance Interferometer (ASTI) Instrument Categories ...

  8. ARM - Campaign Instrument - ldis

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Laser Disdrometer (LDIS) Instrument Categories Surface Meteorology Campaigns Marine ARM GPCI ...

  9. ARM - Instrument - ldis

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Laser Disdrometer (LDIS) Instrument Categories Surface Meteorology A laser disdrometer measures the reduction ...

  10. ARM - Instrument - suomigps

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : SuomiNet Global Positioning System (SUOMIGPS) Instrument Categories Atmospheric Profiling General Overview...

  11. ARM - Instrument - wpdn

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Wind Profiler Demo Network (WPDN) Instrument Categories Atmospheric Profiling ...

  12. ARM - Instrument - sonicwind

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : ultrasonic wind sensor (SONICWIND) Instrument Categories Surface Meteorology ...

  13. ARM - Instrument - thwaps

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Temperature, Humidity, Wind and Pressure Sensors (THWAPS) Instrument Categories ...

  14. ARM - Campaign Instrument - rwp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Radar Wind Profiler (RWP) Instrument Categories Atmospheric Profiling ...

  15. ARM - Site Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AtlanticInstruments ENA Related Links Facilities and Instruments ES&H Guidance Statement Operations Science Field Campaigns Visiting the Site ENA Fact Sheet (PDF, 512KB) Images Information for Guest Scientists Contacts Instruments : Eastern North Atlantic Active Retired Active instruments are currently deployed at fixed or mobile facilities or are available through the ARM Aerial Facility. ACSM Aerosol Chemical Speciation Monitor Aerosols Browse Plots Browse Data [ Single installation ] AERI

  16. ARM - Site Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    InactiveInstruments NSA Related Links Virtual Tour Facilities and Instruments Barrow Atqasuk Oliktok Point (AMF3) ES&H Guidance Statement Operations Science Field Campaigns Visiting the Site NSA Fact Sheet Images Information for Guest Scientists Contacts Instruments : Central Facility, Atqasuk AK Active Retired Active instruments are currently deployed at fixed or mobile facilities or are available through the ARM Aerial Facility. MFRSR Multifilter Rotating Shadowband Radiometer Radiometric

  17. Instrumentation | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Research Accelerator Technology ATLAS at the LHC Cosmology & Astrophysics Instrumentation Precision Muon Physics Neutrino Physics Theoretical High Energy Physics Instrumentation Instrumentation The development of new instrumentation, particularly detector technology, provides a common thread that links together a wide range of high-energy physics projects and programs. In order to better understand our universe, we need ways to build detectors with fast response (usually billionths of a

  18. Double deflection system for an electron beam device

    DOE Patents [OSTI]

    Parker, Norman W.; Golladay, Steven D.; Crewe, Albert V.

    1978-01-01

    A double deflection scanning system for electron beam instruments is provided embodying a means of correcting isotropic coma, and anisotropic coma aberrations induced by the magnetic lens of such an instrument. The scanning system deflects the beam prior to entry into the magnetic lens from the normal on-axis intersection of the beam with the lens according to predetermined formulas and thereby reduces the aberrations.

  19. Beam tuning

    SciTech Connect (OSTI)

    Pardo, R.C.; Zinkann, G.P.

    1995-08-01

    A program for configuring the linac, based on previously run configurations for any desired beam was used during the past year. This program uses only a small number of empirical tunes to scale resonator fields to properly accelerate a beam with a different charge-to-mass (q/A) ratio from the original tune configuration. The program worked very well for the PII linac section where we can easily match a new beam`s arrival phase and velocity to the tuned value. It was also fairly successful for the Booster and ATLAS sections of the linac, but not as successful as for the PII linac. Most of the problems are associated with setting the beam arrival time correctly for each major linac section. This problem is being addressed with the development of the capacitive pickup beam phase monitor discussed above. During the next year we expect to improve our ability to quickly configure the linac for new beams and reduce the time required for linac tuning. Already the time required for linac tuning as a percentage of research hours has decreased from 22% in FY 1993 to 15% in the first quarter of FY 1995.

  20. Maskless, resistless ion beam lithography

    SciTech Connect (OSTI)

    Ji, Qing

    2003-03-10

    As the dimensions of semiconductor devices are scaled down, in order to achieve higher levels of integration, optical lithography will no longer be sufficient for the needs of the semiconductor industry. Alternative next-generation lithography (NGL) approaches, such as extreme ultra-violet (EUV), X-ray, electron-beam, and ion projection lithography face some challenging issues with complicated mask technology and low throughput. Among the four major alternative NGL approaches, ion beam lithography is the only one that can provide both maskless and resistless patterning. As such, it can potentially make nano-fabrication much simpler. This thesis investigates a focused ion beam system for maskless, resistless patterning that can be made practical for high-volume production. In order to achieve maskless, resistless patterning, the ion source must be able to produce a variety of ion species. The compact FIB system being developed uses a multicusp plasma ion source, which can generate ion beams of various elements, such as O{sub 2}{sup +}, BF{sub 2}{sup +}, P{sup +} etc., for surface modification and doping applications. With optimized source condition, around 85% of BF{sub 2}{sup +}, over 90% of O{sub 2}{sup +} and P{sup +} have been achieved. The brightness of the multicusp-plasma ion source is a key issue for its application to maskless ion beam lithography. It can be substantially improved by optimizing the source configuration and extractor geometry. Measured brightness of 2 keV He{sup +} beam is as high as 440 A/cm{sup 2} {center_dot} Sr, which represents a 30x improvement over prior work. Direct patterning of Si thin film using a focused O{sub 2}{sup +} ion beam has been investigated. A thin surface oxide film can be selectively formed using 3 keV O{sub 2}{sup +} ions with the dose of 10{sup 15} cm{sup -2}. The oxide can then serve as a hard mask for patterning of the Si film. The process flow and the experimental results for directly patterned poly-Si features

  1. Beam History

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beam History Print Beamline History Request Form To request a beam current histograph from the ALS storage ring beam histograph database, select the year, month, and day, then click on "Submit Request". Histographs are available as far back as February 2, 1994. Year 2016 2015 2014 2013 2012 2011 2010 2009 2008 2007 2006 2005 2004 2003 2002 2001 2000 1999 1998 1997 1996 1995 1994 Month Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Day 01 02 03 04 05 06 07 08 09 10 11 12 13 14 15 16 17

  2. Beam History

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beam History Print Beamline History Request Form To request a beam current histograph from the ALS storage ring beam histograph database, select the year, month, and day, then click on "Submit Request". Histographs are available as far back as February 2, 1994. Year 2016 2015 2014 2013 2012 2011 2010 2009 2008 2007 2006 2005 2004 2003 2002 2001 2000 1999 1998 1997 1996 1995 1994 Month Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Day 01 02 03 04 05 06 07 08 09 10 11 12 13 14 15 16 17

  3. Curtis Instruments | Open Energy Information

    Open Energy Info (EERE)

    Instruments Jump to: navigation, search Logo: Curtis Instruments Name: Curtis Instruments Address: 200 Kisco Ave. Place: Mount Kisco, New York Zip: 10549 Region: Northeast - NY NJ...

  4. Beam Test Facility

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beam Test Facility Beam Test Facility Print Tuesday, 20 October 2009 09:36 Coming Soon

  5. CAES Home

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    MaCS Lab Lab Lead: Joanna Taylor, (208) 533-8178 Focused Ion Beam with EDSEBSDOmniprobe Manufacturer: FEI Company Model: Quanta 3D FEG Instrument Lead: Jatu Burns, (208) 533-8160...

  6. The matter in extreme conditions instrument at the Linac Coherent Light Source

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Nagler, Bob; Arnold, Brice; Bouchard, Gary; Boyce, Richard F.; Boyce, Richard M.; Callen, Alice; Campell, Marc; Curiel, Ruben; Galtier, Eric; Garofoli, Justin; et al

    2015-04-21

    The LCLS beam provides revolutionary capabilities for studying the transient behavior of matter in extreme conditions. The particular strength of the Matter in Extreme Conditions instrument is that it combines the unique LCLS beam with high-power optical laser beams, and a suite of dedicated diagnostics tailored for this field of science. In this paper an overview of the beamline, the capabilities of the instrumentation, and selected highlights of experiments and commissioning results are presented.

  7. ARM - Instrument - brs

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsbrs Documentation ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Broadband Radiometer Station (BRS) Instrument Categories Radiometric Output Value-Added Products This instrument is an input to the following value-added products, which provide improved measurements or derived quantities. 15swfanalbrs1long : Short Wave Flux Analysis: 15-min resolution on BRS data, Long algorithm

  8. ARM - Instrument - nav

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsnav Documentation ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Navigational Location and Attitude (NAV) Instrument Categories Ocean Observations Instruments Location Table Contacts Output Datastreams nav : Ship navigational location and attitude navgps : Ship navigational location and attitude: Position and Heading Data Primary Measurements The following measurements are those

  9. ARM - Instrument - pils

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentspils Documentation PILS : Handbook ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Particle Into Liquid Sampler (PILS) Instrument Categories Aerosols Picture of the Doppler Lidar The Particle-into-Liquid Sampler (PILS) is an aqueous-solution-based online technique for determining bulk chemical composition of ambient aerosol particles. The instrument consists of two units, briefly described

  10. ARM - Instrument - twr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentstwr Documentation TWR : Handbook ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Facility-specific multi-level Meteorological Instrumentation (TWR) Instrument Categories Surface Meteorology Picture of the 60-m Tower General Overview Three tall towers are installed at Atmospheric Radiation Measurement Climate Research Facility sites: a 60-m triangular tower at the Southern Great Plains

  11. Portable instrument for inspecting irradiated nuclear fuel assemblies

    DOE Patents [OSTI]

    Nicholson, Nicholas; Dowdy, Edward J.; Holt, David M.; Stump, Jr., Charles J.

    1985-01-01

    A portable instrument for measuring induced Cerenkov radiation associated with irradiated nuclear fuel assemblies in a water-filled storage pond is disclosed. The instrument includes a photomultiplier tube and an image intensifier which are operable in parallel and simultaneously by means of a field lens assembly and an associated beam splitter. The image intensifier permits an operator to aim and focus the apparatus on a submerged fuel assembly. Once the instrument is aimed and focused, an illumination reading can be obtained with the photomultiplier tube. The instrument includes a lens cap with a carbon-14/phosphor light source for calibrating the apparatus in the field.

  12. ARM - Instrument - nephelometer

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Peak retired TMP S1 Browse Data U. of Helsinki Research Station (SMEAR II), Hyytiala, Finland; AOS retired Originating instrument has been retired at this location See Also...

  13. ARM - Campaign Instrument - pils

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Into Liquid Sampler (PILS) Instrument Categories Aerosols Campaigns 2000 Houston, Texas Air Quality Study Download Data Off Site Campaign : various, including non-ARM sites,...

  14. ARM - Campaign Instrument - cpc

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Condensation Particle Counter (CPC) Instrument Categories Aerosols Campaigns 1998 Phoenix Air Quality Study Download Data Off Site Campaign : various, including non-ARM sites,...

  15. ARM - Campaign Instrument - psap

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Soot Absorption Photometer (PSAP) Instrument Categories Aerosols Campaigns 1998 Phoenix Air Quality Study Download Data Off Site Campaign : various, including non-ARM sites,...

  16. ARM - Site Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    12.4M) Outreach COPS Backgrounder (PDF, 306K) Posters AMF Poster, German Vesion Researching Raindrops in the Black Forest News Campaign Images Instruments : Black Forest,...

  17. ARM - Instrument - precnet

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    considered scientifically relevant. Precipitation Locations Southern Great Plains SGP A1 Browse Data Whitewater, KS (ABLE) retired retired Originating instrument has been...

  18. ARM - Campaign Instrument - aerosmassspec

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    (AEROSMASSSPEC) Instrument Categories Aerosols, Airborne Observations, Atmospheric Carbon Campaigns 2006 MAX-Mex-Megacity Aerosol eXperiment - Mexico City Download Data ...

  19. ARM - Instrument - toms

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Users of these data should acknowledge the support of the NASA Goddard Ozone Processing Team. Similar data may also be found from the Ozone Monitoring Instrument (OMI). Output ...

  20. ARM - Instrument - gps

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    : Global Positioning System (GPS) Note: gps is currently inactive andor retired. Active Dates 1970.01.01 - 1970.01.01 Instrument Categories Other General Overview Global...

  1. ARM - Instrument - sacr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    : Scanning ARM cloud radar (SACR) Instrument Categories Cloud Properties Contact(s) Karen Johnson Brookhaven National Laboratory (631) 344-5952 kjohnson@bnl.gov Nitin...

  2. ARM - Instrument - stable

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    around the long axis of the ship (roll), short axis (pitch), and, for some instruments, vertical axis (yaw). ARM currently employs two types of stabilized platforms: one...

  3. ARM - Instrument - sasze

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    building isolated from the elements. ... Data Highland Center, Cape Cod MA; AMF1 retired retired Originating instrument has been retired at this location ...

  4. ARM - Campaign Instrument - dlh

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Laser Hygrometer (DLH) Instrument Categories Airborne Observations Campaigns ARM-FIRE Water Vapor Experiment Download Data Southern Great Plains, 2000.11.01 - 2000.12.31...

  5. ARM - Campaign Instrument - twrmr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Mixing Ratio (TWRMR) Instrument Categories Atmospheric Profiling Campaigns Fall 1997 Water Vapor IOP Download Data Southern Great Plains, 1997.09.15 - 1997.10.05 Water...

  6. ARM - Instrument - rss-2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    be better than 5%, which includes calibration and instrument stability errors. Higher accuracy (1%) can be obtained when the responsivity is tied to the solar...

  7. ARM - Instrument - rss

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    be better than 5%, which includes calibration and instrument stability errors. Higher accuracy (1%) can be obtained when the responsivity is tied to the solar...

  8. ARM - Campaign Instrument - rl

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instrument Categories Aerosols, Atmospheric Profiling Campaigns Remote Cloud Sensing (RCS) Field Evaluation Download Data Southern Great Plains, 1994.04.01 - 1994.05.31...

  9. ARM - Campaign Instrument - wsicloud

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    (WSICLOUD) Instrument Categories Cloud Properties Campaigns Remote Cloud Sensing (RCS) Field Evaluation Download Data Southern Great Plains, 1995.04.01 - 1995.05.31 The...

  10. ARM - Instrument - disdrometer

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Australia retired retired Originating instrument has been retired at this location Contact(s) Mary Jane Bartholomew Brookhaven National Laboratory (631) 344-2444 bartholomew@bnl...

  11. ARM - Instrument - issrwp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instrument Categories Derived Quantities and Models Output Datastreams 915issrwpwindcon : Derived: wind data from the 915RWP (consensus) and sonde, at altitude Primary Measurements ...

  12. Pulse energy measurement at the SXR instrument

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Moeller, Stefan; Brown, Garth; Dakovski, Georgi; Hill, Bruce; Holmes, Michael; Loos, Jennifer; Maida, Ricardo; Paiser, Ernesto; Schlotter, William; Turner, Joshua J.; et al

    2015-04-14

    A gas monitor detector was implemented and characterized at the Soft X-ray Research (SXR) instrument to measure the average, absolute and pulse-resolved photon flux of the LCLS beam in the energy range between 280 and 2000 eV. The detector is placed after the monochromator and addresses the need to provide reliable absolute pulse energy as well as pulse-resolved measurements for the various experiments at this instrument. This detector provides a reliable non-invasive measurement for determining flux levels on the samples in the downstream experimental chamber and for optimizing signal levels of secondary detectors and for the essential need of datamore » normalization. The design, integration into the instrument and operation are described, and examples of its performance are given.« less

  13. Pulse energy measurement at the SXR instrument

    SciTech Connect (OSTI)

    Moeller, Stefan; Brown, Garth; Dakovski, Georgi; Hill, Bruce; Holmes, Michael; Loos, Jennifer; Maida, Ricardo; Paiser, Ernesto; Schlotter, William; Turner, Joshua J.; Wallace, Alex; Jastrow, Ulf; Kreis, Svea; Sorokin, Andrey A.; Tiedtke, Kai

    2015-04-14

    A gas monitor detector was implemented and characterized at the Soft X-ray Research (SXR) instrument to measure the average, absolute and pulse-resolved photon flux of the LCLS beam in the energy range between 280 and 2000 eV. The detector is placed after the monochromator and addresses the need to provide reliable absolute pulse energy as well as pulse-resolved measurements for the various experiments at this instrument. This detector provides a reliable non-invasive measurement for determining flux levels on the samples in the downstream experimental chamber and for optimizing signal levels of secondary detectors and for the essential need of data normalization. The design, integration into the instrument and operation are described, and examples of its performance are given.

  14. ARM - Instrument - aps

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsaps Documentation ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Aerodynamic Particle Sizer (APS) Instrument Categories Aerosols

  15. ARM - Instrument - mti

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsmti Documentation MTI : XDC documentation ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Multispectral Thermal Imager (MTI) Instrument Categories Surface/Subsurface Properties

  16. ARM - Word Seek: Instruments

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Instruments Outreach Home Room News Publications Traditional Knowledge Kiosks Barrow, Alaska Tropical Western Pacific Site Tours Contacts Students Study Hall About ARM Global Warming FAQ Just for Fun Meet our Friends Cool Sites Teachers Teachers' Toolbox Lesson Plans Word Seek: Instruments

  17. The effect of residual gas scattering on Ga ion beam patterning of graphene

    SciTech Connect (OSTI)

    Thissen, Nick F. W. E-mail: a.a.bol@tue.nl; Vervuurt, R. H. J.; Weber, J. W.; Kessels, W. M. M.; Bol, A. A. E-mail: a.a.bol@tue.nl; Mulders, J. J. L.

    2015-11-23

    The patterning of graphene by a 30 kV Ga{sup +} focused ion beam (FIB) is studied by in-situ and ex-situ Raman spectroscopy. It is found that the graphene surrounding the patterned target area can be damaged at remarkably large distances of more than 10 μm. We show that scattering of the Ga ions in the residual gas of the vacuum system is the main cause of the large range of lateral damage, as the size and shape of the tail of the ion beam were strongly dependent on the system background pressure. The range of the damage was therefore greatly reduced by working at low pressures and limiting the total amount of ions used. This makes FIB patterning a feasible alternative to electron beam lithography as long as residual gas scattering is taken into account.

  18. ARM - Instrument - aeth

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsaeth Documentation AETH : Handbook ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Aethalometer (AETH) Instrument Categories Aerosols Picture of the Aerosol Observing System The aethalometer is an instrument that provides a real-time readout of the concentration of "black" or "elemental" carbon aerosol particles (BC or E) in an air stream. It is a self-contained

  19. Online diagnoses of high current-density beams

    SciTech Connect (OSTI)

    Gilpatrick, J.D.

    1994-07-01

    Los Alamos National Laboratory has proposed several CW-proton-beam facilities for production of tritium or transmutation of nuclear waste with beam-current densities greater than 5 mA/mm{sup 2}. The primary beam-diagnostics-instrumentation requirement for these facilities is provision of sufficient beam information to understand and minimize beam-loss. To accomplish this task, the beam-diagnostics instrumentation must measure beam parameters such as the centroids and profiles, total integrated current, and particle loss. Noninterceptive techniques must be used for diagnosis of high-intensity CW beam at low energies due to the large quantity of power deposited in an interceptive diagnostic device by the beam. Transverse and longitudinal centroid measurements have been developed for bunched beams by measuring and processing image currents on the accelerator walls. Transverse beam-profile measurement-techniques have also been developed using the interaction of the particle beam with the background gases near the beam region. This paper will discuss these noninterceptive diagnostic Techniques.

  20. ARM - Instrument Location Table

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Site abbreviations explained in the key. Instrument Name Abbreviation ENA NSA SGP AMF C1 ... XSAPR KEY ENA C1 Eastern North Atlantic NSA C1 Barrow, Alaska NSA EF Extended Facility ...

  1. ARM - Instrument - mfrsr

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lack of spare instruments and replacement parts were the primary reasons for the slow degradation. Around 2005, it was decided to bring the network back to full capacity. After ...

  2. ARM - Instrument - fluxnet

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AsiaFlux, and OzFlux. Locations Tropical Western Pacific TWP X33 Browse Data Howard Springs FluxNet Site retired retired Originating instrument has been retired at this...

  3. ARM - Instrument - rain

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Site TMP M1 Browse Data U. of Helsinki Research Station (SMEAR II), Hyytiala, Finland; AMF2 retired Originating instrument has been retired at this location Contact(s)...

  4. ARM - Instrument - vdis

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    AMF2 retired TMP M1 Browse Data U. of Helsinki Research Station (SMEAR II), Hyytiala, Finland; AMF2 retired Originating instrument has been retired at this location Contact(s)...

  5. ARM - Instrument - ksumeso

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The data are provided and quality assured by the High Plains Climate Center. All stations are Campbell CR10 dataloggers with Phys-Chem Temp RH probes, Texas Instrument (0.01") ...

  6. ARM - Campaign Instrument - aosmet

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Meteorological Measurements associated with the Aerosol Observing System...

  7. ARM - Campaign Instrument - aircraftcabin

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Aircraft Cabin Parameters (e.g. attitude, motion, ambient state)...

  8. ARM - Instrument - vceil

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsvceil Documentation VCEIL : Handbook Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Error occurred. Instrument...

  9. ARM - Campaign Instrument - gpswv

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsgpswv Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Water Vapor from Global Positioning...

  10. ARM - Instrument - twrcam

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Data Highland Center, Cape Cod MA; AMF1 retired PYE M1 Browse Data Browse Plots Point Reyes, CA retired retired Originating instrument has been retired at this location...

  11. ARM - Instrument - nfov

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Plots Highland Center, Cape Cod MA; AMF1 retired PYE M1 Browse Data Browse Plots Point Reyes, CA retired retired Originating instrument has been retired at this location...

  12. ARM - Instrument - cfh

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentscfh Documentation Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Error occurred. Instrument "cfh

  13. ARM - Instrument - marinemet

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsmarinemet Documentation Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Error occurred. Instrument "marinemet" does not exist.

  14. ARM - Instrument - pgsiso

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentspgsiso Documentation Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Error occurred. Instrument "pgsiso" does not exist.

  15. ARM - Instrument - radiocarbon

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsradiocarbon Documentation Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Error occurred. Instrument "radiocarbon" does not exist.

  16. ARM - Instrument - tbs

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentstbs Documentation Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send Error occurred. Instrument "tbs" does not exist.

  17. ARM - Campaign Instrument - cirpas

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentscirpas Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : NPS CIRPAS Twin Otter Aircraft (CIRPAS)...

  18. ARM - Campaign Instrument - tdlas

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentstdlas Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Tunable Diode Laser Absorption...

  19. ARM - Campaign Instrument - soar

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentssoar Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Shipboard Oceanographic and Atmospheric...

  20. ARM - Campaign Instrument - teom

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsteom Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Tapered Element Oscillating Microbalance...

  1. ARM - Campaign Instrument - smart

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentssmart Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Surface-Sensing Measurements for...

  2. ARM - Campaign Instrument - hvps

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentshvps Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : High Volume Precipitation Spectrometer...

  3. ARM - Campaign Instrument - issrwp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsissrwp Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : 915RWP Derived Data with Sonde at...

  4. ARM - Campaign Instrument - pip

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentspip Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Precipitation Imaging Probe (PIP)...

  5. ARM - Instrument - spn

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsspn Documentation Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Instrument : Sunshine Pyranometer (SPN) The...

  6. ARM - Campaign Instrument - ronbrown

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsronbrown Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : NOAA Research Vessel Ron Brown...

  7. ARM - Campaign Instrument - hsrl

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentshsrl Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : High Spectral Resolution Lidar (HSRL)...

  8. ARM - Campaign Instrument - precipret

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsprecipret Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Precipitation Retrievals (PRECIPRET)...

  9. ARM - Campaign Instrument - rsp

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsrsp Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Research Scanning Polarimeter (RSP)...

  10. ARM - Campaign Instrument - aats

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    govInstrumentsaats Comments? We would love to hear from you Send us a note below or call us at 1-888-ARM-DATA. Send Campaign Instrument : Ames Airborne Tracking Sunphotometer...