National Library of Energy BETA

Sample records for focused ion beam

  1. Focused ion beam system

    DOE Patents [OSTI]

    Leung, K.; Gough, R.A.; Ji, Q.; Lee, Y.Y.

    1999-08-31

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 {mu}m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 m or less. 13 figs.

  2. Focused ion beam system

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Gough, Richard A.; Ji, Qing; Lee, Yung-Hee Yvette

    1999-01-01

    A focused ion beam (FIB) system produces a final beam spot size down to 0.1 .mu.m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 .mu.m or less.

  3. ION BEAM FOCUSING MEANS FOR CALUTRON

    DOE Patents [OSTI]

    Backus, J.G.

    1959-06-01

    An ion beam focusing arrangement for calutrons is described. It provides a virtual focus of origin for the ion beam so that the ions may be withdrawn from an arc plasma of considerable width providing greater beam current and accuracy. (T.R.H.)

  4. Focused electron and ion beam systems

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Reijonen, Jani; Persaud, Arun; Ji, Qing; Jiang, Ximan

    2004-07-27

    An electron beam system is based on a plasma generator in a plasma ion source with an accelerator column. The electrons are extracted from a plasma cathode in a plasma ion source, e.g. a multicusp plasma ion source. The beam can be scanned in both the x and y directions, and the system can be operated with multiple beamlets. A compact focused ion or electron beam system has a plasma ion source and an all-electrostatic beam acceleration and focusing column. The ion source is a small chamber with the plasma produced by radio-frequency (RF) induction discharge. The RF antenna is wound outside the chamber and connected to an RF supply. Ions or electrons can be extracted from the source. A multi-beam system has several sources of different species and an electron beam source.

  5. Focused ion beam source method and apparatus

    DOE Patents [OSTI]

    Pellin, Michael J.; Lykke, Keith R.; Lill, Thorsten B.

    2000-01-01

    A focused ion beam having a cross section of submicron diameter, a high ion current, and a narrow energy range is generated from a target comprised of particle source material by laser ablation. The method involves directing a laser beam having a cross section of critical diameter onto the target, producing a cloud of laser ablated particles having unique characteristics, and extracting and focusing a charged particle beam from the laser ablated cloud. The method is especially suited for producing focused ion beams for semiconductor device analysis and modification.

  6. Focused ion beam micromilling and articles therefrom

    DOE Patents [OSTI]

    Lamartine, Bruce C. (Los Alamos, NM); Stutz, Roger A. (Los Alamos, NM)

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  7. Focused ion beam micromilling and articles therefrom

    DOE Patents [OSTI]

    Lamartine, B.C.; Stutz, R.A.

    1998-06-30

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  8. Development of a focused ion beam micromachining system

    SciTech Connect (OSTI)

    Pellerin, J.G.; Griffis, D.; Russell, P.E.

    1988-12-01

    Focused ion beams are currently being investigated for many submicron fabrication and analytical purposes. An FIB micromachining system consisting of a UHV vacuum system, a liquid metal ion gun, and a control and data acquisition computer has been constructed. This system is being used to develop nanofabrication and nanomachining techniques involving focused ion beams and scanning tunneling microscopes.

  9. Electrostatic lens to focus an ion beam to uniform density

    DOE Patents [OSTI]

    Johnson, Cleland H.

    1977-01-11

    A focusing lens for an ion beam having a gaussian or similar density profile is provided. The lens is constructed to provide an inner zero electrostatic field, and an outer electrostatic field such that ions entering this outer field are deflected by an amount that is a function of their distance from the edge of the inner field. The result is a beam that focuses to a uniform density in a manner analogous to that of an optical ring lens. In one embodiment, a conically-shaped network of fine wires is enclosed within a cylindrical anode. The wire net together with the anode produces a voltage field that re-directs the outer particles of the beam while the axial particles pass undeflected through a zero field inside the wire net. The result is a focused beam having a uniform intensity over a given target area and at a given distance from the lens.

  10. Ultrahigh vacuum focused ion beam micromill and articles therefrom

    DOE Patents [OSTI]

    Lamartine, B.C.; Stutz, R.A.

    1998-02-24

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are disclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters. 6 figs.

  11. Ultrahigh vacuum focused ion beam micromill and articles therefrom

    DOE Patents [OSTI]

    Lamartine, Bruce C. (Los Alamos, NM); Stutz, Roger A. (Los Alamos, NM)

    1998-01-01

    An ultrahigh vacuum focused ion beam micromilling apparatus and process are isclosed. Additionally, a durable data storage medium using the micromilling process is disclosed, the durable data storage medium capable of storing, e.g., digital or alphanumeric characters as well as graphical shapes or characters.

  12. Focused ion beam and scanning electron microscopy for 3D materials...

    Office of Scientific and Technical Information (OSTI)

    microscopy for 3D materials characterization. Citation Details In-Document Search Title: Focused ion beam and scanning electron microscopy for 3D materials characterization. ...

  13. Diagnostics of ion beam generated from a Mather type plasma focus device

    SciTech Connect (OSTI)

    Lim, L. K. Ngoi, S. K. Wong, C. S. Yap, S. L.

    2014-03-05

    Diagnostics of ion beam emission from a 3 kJ Mather-type plasma focus device have been performed for deuterium discharge at low pressure regime. Deuterium plasma focus was found to be optimum at pressure of 0.2 mbar. The energy spectrum and total number of ions per shot from the pulsed ion beam are determined by using biased ion collectors, Faraday cup, and solid state nuclear track detector CR-39. Average energy of the ion beam obtained is about 60 keV. Total number of the ions has been determined to be in the order of 10{sup 11} per shot. Solid state nuclear track detectors (SSNTD) CR39 are employed to measure the particles at all angular direction from end on (0) to side on (90). Particle tracks are registered by SSNTD at 30 to 90, except the one at the end-on 0.

  14. Large Area Microcorrals and Cavity Formation on Cantilevers using a Focused Ion Beam

    SciTech Connect (OSTI)

    Saraf, Laxmikant V.; Britt, David W.

    2011-09-14

    We utilize focused ion beam (FIB) to explore various sputtering parameters to form large area microcorrals and cavities on cantilevers. Microcorrals were rapidly created by modifying ion beam blur and overlaps. Modification in FIB sputtering parameters affects the periodicity and shape of corral microstructure. Cantilever deflections show ion beam amorphization effects as a function of sputtered area and cantilever base cavities with or without side walls. The FIB sputtering parameters address a method for rapid creation of a cantilever tensiometer with integrated fluid storage and delivery.

  15. Plasma focus ion beam fluence and fluxFor various gases

    SciTech Connect (OSTI)

    Lee, S. [Centre for Plasma Research, INTI International University, 71800 Nilai (Malaysia) [Centre for Plasma Research, INTI International University, 71800 Nilai (Malaysia); Institute for Plasma Focus Studies, 32 Oakpark Drive, Chadstone 3148 (Australia); Physics Department, University of Malaya (Malaysia); Saw, S. H. [Centre for Plasma Research, INTI International University, 71800 Nilai (Malaysia) [Centre for Plasma Research, INTI International University, 71800 Nilai (Malaysia); Institute for Plasma Focus Studies, 32 Oakpark Drive, Chadstone 3148 (Australia)

    2013-06-15

    A recent paper derived benchmarks for deuteron beam fluence and flux in a plasma focus (PF) [S. Lee and S. H. Saw, Phys. Plasmas 19, 112703 (2012)]. In the present work we start from first principles, derive the flux equation of the ion beam of any gas; link to the Lee Model code and hence compute the ion beam properties of the PF. The results show that, for a given PF, the fluence, flux, ion number and ion current decrease from the lightest to the heaviest gas except for trend-breaking higher values for Ar fluence and flux. The energy fluence, energy flux, power flow, and damage factors are relatively constant from H{sub 2} to N{sub 2} but increase for Ne, Ar, Kr and Xe due to radiative cooling and collapse effects. This paper provides much needed benchmark reference values and scaling trends for ion beams of a PF operated in any gas.

  16. A compact broadband ion beam focusing device based on laser-driven megagauss thermoelectric magnetic fields

    SciTech Connect (OSTI)

    Albertazzi, B.; D'Humières, E.; Lancia, L.; Antici, P.; Dervieux, V.; Nakatsutsumi, M.; Romagnani, L.; Fuchs, J.; Böcker, J.; Swantusch, M.; Willi, O.; Bonlie, J.; Cauble, B.; Shepherd, R.; Breil, J.; Feugeas, J. L.; Nicolaï, P.; Tikhonchuk, V. T.; Chen, S. N.; Sentoku, Y.; and others

    2015-04-15

    Ultra-intense lasers can nowadays routinely accelerate kiloampere ion beams. These unique sources of particle beams could impact many societal (e.g., proton-therapy or fuel recycling) and fundamental (e.g., neutron probing) domains. However, this requires overcoming the beam angular divergence at the source. This has been attempted, either with large-scale conventional setups or with compact plasma techniques that however have the restriction of short (<1 mm) focusing distances or a chromatic behavior. Here, we show that exploiting laser-triggered, long-lasting (>50 ps), thermoelectric multi-megagauss surface magnetic (B)-fields, compact capturing, and focusing of a diverging laser-driven multi-MeV ion beam can be achieved over a wide range of ion energies in the limit of a 5° acceptance angle.

  17. Ion focusing

    DOE Patents [OSTI]

    Cooks, Robert Graham; Baird, Zane; Peng, Wen-Ping

    2015-11-10

    The invention generally relates to apparatuses for focusing ions at or above ambient pressure and methods of use thereof. In certain embodiments, the invention provides an apparatus for focusing ions that includes an electrode having a cavity, at least one inlet within the electrode configured to operatively couple with an ionization source, such that discharge generated by the ionization source is injected into the cavity of the electrode, and an outlet. The cavity in the electrode is shaped such that upon application of voltage to the electrode, ions within the cavity are focused and directed to the outlet, which is positioned such that a proximal end of the outlet receives the focused ions and a distal end of the outlet is open to ambient pressure.

  18. Site-controlled fabrication of Ga nanodroplets by focused ion beam

    SciTech Connect (OSTI)

    Xu, Xingliang; Wang, Zhiming M.; Wu, Jiang; Li, Handong; Zhou, Zhihua; Wang, Xiaodong

    2014-03-31

    Ga droplets are created by focused ion beam irradiation of GaAs surface. We report that ordered Ga droplets can be formed on the GaAs surface without any implantation damage. The droplets are characterized with bigger sizes than those droplets formed on damaged area. These aligned Ga droplets are formed via the migration of Ga atoms from ion irradiation area to the edge of undamaged GaAs surface and further nucleation into droplets. The morphological evolution and size distribution of these nanodroplets are investigated systematically with different beam irradiation time and incident angles. Based on this method, well positioned Ga nanodroplets, such as chains, are achieved by using focus ion beam patterning. The controllable assembly of droplets on undamaged semiconductor surface can be used to fabricate templates, to fabricate quantum structures and quantum devices by droplet epitaxy technique.

  19. Self-focusing of a Gaussian electromagnetic beam in a multi-ions plasma

    SciTech Connect (OSTI)

    Misra, Shikha; Sodha, M. S.; Mishra, S. K.

    2013-10-15

    In this paper, the authors have developed a formulation for the dependence of electron and ion densities on the irradiance of an electromagnetic beam in a plasma with multiply charged ions, corresponding to collisional, ponderomotive, and relativistic-ponderomotive nonlinearities and different electron/ion temperatures; consequently, the corresponding expressions for the electron density modification in the presence of an electromagnetic (em) field have been derived. Paraxial approach in the vicinity of intensity maximum has been adopted to analyze the propagation characteristics of an em beam in such plasmas; on the basis of this analysis, critical curves and self-focusing curves have been computed numerically and graphically illustrated. For a numerical appreciation of the analysis, we have specifically carried out the computations for the simultaneous presence of singly and doubly charged ions in the plasma. As an important outcome, it is seen that the nonlinear effects (and hence self-focusing) get suppressed in the presence of multiply ionized ions; the conditions for the three modes of em-beam propagation viz. oscillatory focusing/defocusing and steady divergence have been discussed.

  20. Carbon ion beam focusing using laser irradiated heated diamond hemispherical shells

    SciTech Connect (OSTI)

    Offermann, Dustin T; Flippo, Kirk A; Gaillard, Sandrine A

    2009-01-01

    Experiments preformed at the Los Alamos National Laboratory's Trident Laser Facility were conducted to observe the acceleration and focusing of carbon ions via the TNSA mechanism using hemispherical diamond targets. Trident is a 200TW class laser system with 80J of 1 {micro}m, short-pulse light delivered in 0.5ps, with a peak intensity of 5 x 10{sup 20} W/cm{sup 2}. Targets where Chemical Vapor Deposition (CVD) diamonds formed into hemispheres with a radius of curvature of 400{micro}m and a thickness of 5{micro}m. The accelerated ions from the hemisphere were diagnosed by imaging the shadow of a witness copper mesh grid located 2mm behind the target onto a film pack located 5cm behind the target. Ray tracing was used to determine the location of the ion focal spot. The TNSA mechanism favorably accelerates hydrogen found in and on the targets. To make the carbon beam detectable, targets were first heated to several hundred degrees Celsius using a CW, 532nm, 8W laser. Imaging of the carbon beam was accomplished via an auto-radiograph of a nuclear activated lithium fluoride window in the first layer of the film pack. The focus of the carbon ion beam was determined to be located 630 {+-} 110 {micro}m from the vertex of the hemisphere.

  1. Lateral damage in graphene carved by high energy focused gallium ion beams

    SciTech Connect (OSTI)

    Liao, Zhongquan; Zhang, Tao; Jordan, Rainer; Gall, Martin; Rosenkranz, Rüdiger; Dianat, Arezoo; Cuniberti, Gianaurelio; and others

    2015-07-06

    Raman mapping is performed to study the lateral damage in supported monolayer graphene carved by 30 keV focused Ga{sup +} beams. The evolution of the lateral damage is tracked based on the profiles of the intensity ratio between the D (1341 cm{sup −1}) and G (1582 cm{sup −1}) peaks (I{sub D}/I{sub G}) of the Raman spectra. The I{sub D}/I{sub G} profile clearly reveals the transition from stage 2 disorder into stage 1 disorder in graphene along the direction away from the carved area. The critical lateral damage distance spans from <1 μm up to more than 30 μm in the experiment, depending on the parameters used for carving the graphene. The wide damage in the lateral direction is attributed to the deleterious tail of unfocused ions in the ion beam probe. The study raises the attention on potential sample damage during direct patterning of graphene nanostructures using the focused ion beam technique. Minimizing the total carving time is recommended to mitigate the lateral damage.

  2. Investigation of Generation, Acceleration, Transport and Final Focusing of High-Intensity Heavy Ion Beams from Sources to Targets

    SciTech Connect (OSTI)

    Chiping Chen

    2006-10-26

    Under the auspices of the research grant, the Intense Beam Theoretical Research Goup at Massachusetts Institute of Technology's Plasma Science and Fusion Center made significant contributions in a number of important areas in the HIF and HEDP research, including: (a) Derivation of rms envelope equations and study of rms envelope dynamics for high-intensity heavy ion beams in a small-aperture AG focusing transport systems; (b) Identification of a new mechanism for chaotic particle motion, halo formation, and beam loss in high-intensity heavy ion beams in a small-aperture AG focusing systems; Development of elliptic beam theory; (d) Study of Physics Issues in the Neutralization Transport Experiment (NTX).

  3. High current density ion beam obtained by a transition to a highly focused state in extremely low-energy region

    SciTech Connect (OSTI)

    Hirano, Y. E-mail: hirano.yoichi@phys.cst.nihon-u.ac.jp; Kiyama, S.; Koguchi, H.; Fujiwara, Y.; Sakakita, H.

    2015-11-15

    A high current density (≈3 mA/cm{sup 2}) hydrogen ion beam source operating in an extremely low-energy region (E{sub ib} ≈ 150–200 eV) has been realized by using a transition to a highly focused state, where the beam is extracted from the ion source chamber through three concave electrodes with nominal focal lengths of ≈350 mm. The transition occurs when the beam energy exceeds a threshold value between 145 and 170 eV. Low-level hysteresis is observed in the transition when E{sub ib} is being reduced. The radial profiles of the ion beam current density and the low temperature ion current density can be obtained separately using a Faraday cup with a grid in front. The measured profiles confirm that more than a half of the extracted beam ions reaches the target plate with a good focusing profile with a full width at half maximum of ≈3 cm. Estimation of the particle balances in beam ions, the slow ions, and the electrons indicates the possibility that the secondary electron emission from the target plate and electron impact ionization of hydrogen may play roles as particle sources in this extremely low-energy beam after the compensation of beam ion space charge.

  4. Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

    SciTech Connect (OSTI)

    Overweg, H. C.; Haan, A. M. J. den; Eerkens, H. J.; Bossoni, L.; Oosterkamp, T. H.; Alkemade, P. F. A.; La Rooij, A. L.; Spreeuw, R. J. C.

    2015-08-17

    We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10{sup −12} Am{sup 2}, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.

  5. Implementation of focused ion beam (FIB) system in characterization of nuclear fuels and materials

    SciTech Connect (OSTI)

    A. Aitkaliyeva; J. W. Madden; B. D. Miller; J I Cole; T A Hyde

    2014-10-01

    Beginning in 2007, a program was established at the Idaho National Laboratory to update key capabilities enabling microstructural and micro-chemical characterization of highly irradiated and/or radiologically contaminated nuclear fuels and materials at scales that previously had not been achieved for these types of materials. Such materials typically cannot be contact handled and pose unique hazards to instrument operators, facilities, and associated personnel. One of the first instruments to be acquired was a Dual Beam focused ion beam (FIB)-scanning electron microscope (SEM) to support preparation of transmission electron microscopy and atom probe tomography samples. Over the ensuing years, techniques have been developed and operational experience gained that has enabled significant advancement in the ability to characterize a variety of fuel types including metallic, ceramic, and coated particle fuels, obtaining insights into in-reactor degradation phenomena not obtainable by any other means. The following article describes insights gained, challenges encountered, and provides examples of unique results obtained in adapting Dual Beam FIB technology to nuclear fuels characterization.

  6. Enhanced collective focusing of intense neutralized ion beam pulses in the presence of weak solenoidal magnetic fields

    SciTech Connect (OSTI)

    Dorf, Mikhail A. [Lawrence Livermore National Laboratory, Livermore, California 94550 (United States); Davidson, Ronald C.; Kaganovich, Igor D.; Startsev, Edward A. [Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)

    2012-05-15

    The design of ion drivers for warm dense matter and high energy density physics applications and heavy ion fusion involves transverse focusing and longitudinal compression of intense ion beams to a small spot size on the target. To facilitate the process, the compression occurs in a long drift section filled with a dense background plasma, which neutralizes the intense beam self-fields. Typically, the ion bunch charge is better neutralized than its current, and as a result a net self-pinching (magnetic) force is produced. The self-pinching effect is of particular practical importance, and is used in various ion driver designs in order to control the transverse beam envelope. In the present work we demonstrate that this radial self-focusing force can be significantly enhanced if a weak (B {approx} 100 G) solenoidal magnetic field is applied inside the neutralized drift section, thus allowing for substantially improved transport. It is shown that in contrast to magnetic self-pinching, the enhanced collective self-focusing has a radial electric field component and occurs as a result of the overcompensation of the beam charge by plasma electrons, whereas the beam current becomes well-neutralized. As the beam leaves the neutralizing drift section, additional transverse focusing can be applied. For instance, in the neutralized drift compression experiments (NDCX) a strong (several Tesla) final focus solenoid is used for this purpose. In the present analysis we propose that the tight final focus in the NDCX experiments may possibly be achieved by using a much weaker (few hundred Gauss) magnetic lens, provided the ion beam carries an equal amount of co-moving neutralizing electrons from the preceding drift section into the lens. In this case the enhanced focusing is provided by the collective electron dynamics strongly affected by a weak applied magnetic field.

  7. Enhanced collective focusing of intense neutralized ion beam pulses in the presence of weak solenoidal magnetic fields

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Dorf, Mikhail A.; Davidson, Ronald C.; Kaganovich, Igor D.; Startsev, Edward A.

    2012-05-31

    In this study, the design of ion drivers for warm dense matter and high energy density physics applications and heavy ion fusion involves transverse focusing and longitudinal compression of intense ion beams to a small spot size on the target. To facilitate the process, the compression occurs in a long drift section filled with a dense background plasma, which neutralizes the intense beam self-fields. Typically, the ion bunch charge is better neutralized than its current, and as a result a net self-pinching (magnetic) force is produced. The self-pinching effect is of particular practical importance, and is used in various ionmore » driver designs in order to control the transverse beam envelope. In the present work we demonstrate that this radial self-focusing force can be significantly enhanced if a weak (B~100 G) solenoidal magnetic field is applied inside the neutralized drift section, thus allowing for substantially improved transport. It is shown that in contrast to magnetic self-pinching, the enhanced collective self-focusing has a radial electric field component and occurs as a result of the overcompensation of the beam charge by plasmaelectrons, whereas the beam current becomes well-neutralized. As the beam leaves the neutralizing drift section, additional transverse focusing can be applied. For instance, in the neutralized drift compression experiments (NDCX) a strong (several Tesla) final focus solenoid is used for this purpose. In the present analysis we propose that the tight final focus in the NDCX experiments may possibly be achieved by using a much weaker (few hundred Gauss) magnetic lens, provided the ion beam carries an equal amount of co-moving neutralizing electrons from the preceding drift section into the lens. In this case the enhanced focusing is provided by the collective electrondynamics strongly affected by a weak applied magnetic field.« less

  8. FINAL FOCUS ION BEAM INTENSITY FROM TUNGSTEN FOIL CALORIMETER AND SCINTILLATOR IN NDCX-I

    SciTech Connect (OSTI)

    Lidia, S.M.; Bieniosek, F.; Henestroza, E.; Ni, P.; Seidl, P.

    2010-04-30

    Laboratory high energy density experiments using ion beam drivers rely upon the delivery of high-current, high-brightness ion beams with high peak intensity onto targets. Solid-state scintillators are typically used to measure the ion beam spatial profile but they display dose-dependent degradation and aging effects. These effects produce uncertainties and limit the accuracy of measuring peak beam intensities delivered to the target. For beam tuning and characterizing the incident beam intensity, we have developed a cross-calibrating diagnostic suite that extends the upper limit of measurable peak intensity dynamic range. Absolute intensity calibration is obtained with a 3 {micro}m thick tungsten foil calorimeter and streak spectrometer. We present experimental evidence for peak intensity measures in excess of 400 kW/cm{sup 2} using a 0.3 MV, 25 mA, 5-20 {micro}sec K{sup +1} beam. Radiative models and thermal diffusion effects are discussed because they affect temporal and spatial resolution of beam intensity profiles.

  9. The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions

    SciTech Connect (OSTI)

    Cooper, David; Twitchett-Harrison, Alison C.; Midgley, Paul A.; Dunin-Borkowski, Rafal E.

    2007-05-01

    Electron beam irradiation is shown to significantly influence phase images recorded from focused ion beam milled GaAs p-n junction specimens examined using off-axis electron holography in the transmission electron microscope. Our results show that the use of improved electrical connections to the specimen overcomes this problem, and may allow the correct built in potential across the junction to be recovered.

  10. Characterization and focusing of light ion beams generated by ultra-intensely irradiated thin foils at the kilojoule scale

    SciTech Connect (OSTI)

    Offermann, D. T.; Flippo, K. A.; Cobble, J.; Schmitt, M. J.; Gaillard, S. A.; Bartal, T.; Rose, D. V.; Welch, D. R.; Geissel, M.; Schollmeier, M.

    2011-05-15

    We present the first observations of focused multi-MeV carbon ion beams generated using ultra-intense shortpulse laser interactions with thin hemispherical (400{mu}m radius) targets. The experiments were performed at the Trident laser facility (80 J, 0.6 ps, 2x10{sup 20}W/cm{sup 2}) at Los Alamos National Laboratory and at the Omega EP (extended performance) facility (1 kJ, 10 ps, 5x10{sup 18}W/cm{sup 2}) at the Laboratory for Laser Energetics. The targets were chemical vapor deposition diamond, hemi-shells and were heated to remove contaminants. The ion beam focusing was characterized by tracing the projection of a witness mesh in the ion beam on a lithium fluoride nuclear activation detector. From the data, we infer that the divergence of the beam changes as a function of time. We present a 2-D isothermal model to explain the dynamics. We also present discrepancies in the peak proton and carbon ion energies from the two facilities. The implication of which is a fundamental difference in the temporal evolution of the beams from the two facilities. Simulations using the hybrid particle in cell code, Lsp were performed and compared with the experiments.

  11. Focused-ion-beam induced damage in thin films of complex oxide BiFeO{sub 3}

    SciTech Connect (OSTI)

    Siemons, W.; Beekman, C.; Budai, J. D.; Christen, H. M.; Fowlkes, J. D.; Balke, N.; Tischler, J. Z.; Xu, R.; Liu, W.; Gonzales, C. M.

    2014-02-01

    An unexpected, strong deterioration of crystal quality is observed in epitaxial perovskite BiFeO{sub 3} films in which microscale features have been patterned by focused-ion-beam (FIB) milling. Specifically, synchrotron x-ray microdiffraction shows that the damaged region extends to tens of μm, but does not result in measureable changes to morphology or stoichiometry. Therefore, this change would go undetected with standard laboratory equipment, but can significantly influence local material properties and must be taken into account when using a FIB to manufacture nanostructures. The damage is significantly reduced when a thin metallic layer is present on top of the film during the milling process, clearly indicating that the reduced crystallinity is caused by ion beam induced charging.

  12. High-pressure generation using double stage micro-paired diamond anvils shaped by focused ion beam

    SciTech Connect (OSTI)

    Sakai, Takeshi Ohfuji, Hiroaki; Yagi, Takehiko; Irifune, Tetsuo; Ohishi, Yasuo; Hirao, Naohisa; Suzuki, Yuya; Kuroda, Yasushi; Asakawa, Takayuki; Kanemura, Takashi

    2015-03-15

    Micron-sized diamond anvils with a 3 ?m culet were successfully processed using a focused ion beam (FIB) system and the generation of high pressures was confirmed using the double stage diamond anvil cell technique. The difficulty of aligning two second-stage micro-anvils was solved via the paired micro-anvil method. Micro-manufacturing using a FIB system enables us to control anvil shape, process any materials, including nano-polycrystalline diamond and single crystal diamond, and assemble the sample exactly in a very small space between the second-stage anvils. This method is highly reproducible. High pressures over 300 GPa were achieved, and the pressure distribution around the micro-anvil culet was evaluated by using a well-focused synchrotron micro-X-ray beam.

  13. Electron density profile measurements at a self-focusing ion beam with high current density and low energy extracted through concave electrodes

    SciTech Connect (OSTI)

    Fujiwara, Y. Nakamiya, A.; Sakakita, H.; Innovative Plasma Technologies Group, National Institute of Advanced Industrial Science and Technology , Ibaraki ; Hirano, Y.; Laboratory of Physics, College of Science and Technologies, Nihon University, Tokyo ; Kiyama, S.; Koguchi, H.

    2014-02-15

    The self-focusing phenomenon has been observed in a high current density and low energy ion beam. In order to study the mechanism of this phenomenon, a special designed double probe to measure the electron density and temperature is installed into the chamber where the high current density ion beam is injected. Electron density profile is successfully measured without the influence of the ion beam components. Estimated electron temperature and density are ?0.9 eV and ?8 10{sup 8} cm{sup ?3} at the center of ion beam cross section, respectively. It was found that a large amount of electrons are spontaneously accumulated in the ion beam line in the case of self-forcing state.

  14. Ion Beam Materials Lab

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Ion Beam Materials Lab Ion Beam Materials Lab A new research frontier awaits! Our door is open and we thrive on mutually beneficial partnerships, collaborations that drive innovations and new technologies. April 12, 2012 Ion Beam Danfysik Implanter High Voltage Terminal. Contact Yongqiang Wang (505) 665-1596 Email Devoted to the characterization and modification of surfaces through the use of ion beams The Ion Beam Materials Laboratory (IBML) is a Los Alamos National Laboratory resource devoted

  15. Comparison of SOFC Cathode Microstructure Quantified using X-ray Nanotomography and Focused Ion Beam - Scanning Electron Microscopy

    SciTech Connect (OSTI)

    Nelson, George J.; Harris, William H.; Lombardo, Jeffrey J.; Izzo, Jr., John R.; Chiu, W. K. S.; Tanasini, Pietro; Cantoni, Marco; Van herle, Jan; Comninellis, Christos; Andrews, Joy C.; Liu, Yijin; Pianetta, Piero; Chu, Yong

    2011-03-24

    X-ray nanotomography and focused ion beam scanning electron microscopy (FIB-SEM) have been applied to investigate the complex 3D microstructure of solid oxide fuel cell (SOFC) electrodes at spatial resolutions of 45 nm and below. The application of near edge differential absorption for x-ray nanotomography and energy selected backscatter detection for FIBSEM enable elemental mapping within the microstructure. Using these methods, non-destructive 3D x-ray imaging and FIBSEM serial sectioning have been applied to compare three-dimensional elemental mapping of the LSM, YSZ, and pore phases in the SOFC cathode microstructure. The microstructural characterization of an SOFC cathode is reported based on these measurements. The results presented demonstrate the viability of x-ray nanotomography as a quantitative characterization technique and provide key insights into the SOFC cathode microstructure.

  16. Broad beam ion implanter

    DOE Patents [OSTI]

    Leung, K.N.

    1996-10-08

    An ion implantation device for creating a large diameter, homogeneous, ion beam is described, as well as a method for creating same, wherein the device is characterized by extraction of a diverging ion beam and its conversion by ion beam optics to an essentially parallel ion beam. The device comprises a plasma or ion source, an anode and exit aperture, an extraction electrode, a divergence-limiting electrode and an acceleration electrode, as well as the means for connecting a voltage supply to the electrodes. 6 figs.

  17. Broad beam ion implanter

    DOE Patents [OSTI]

    Leung, Ka-Ngo

    1996-01-01

    An ion implantation device for creating a large diameter, homogeneous, ion beam is described, as well as a method for creating same, wherein the device is characterized by extraction of a diverging ion beam and its conversion by ion beam optics to an essentially parallel ion beam. The device comprises a plasma or ion source, an anode and exit aperture, an extraction electrode, a divergence-limiting electrode and an acceleration electrode, as well as the means for connecting a voltage supply to the electrodes.

  18. Compact electron beam focusing column

    SciTech Connect (OSTI)

    Persaud, Arun; Leung, Ka-Ngo; Reijonen, Jani

    2001-07-13

    A novel design for an electron beam focusing column has been developed at LBNL. The design is based on a low-energy spread multicusp plasma source which is used as a cathode for electron beam production. The focusing column is 10 mm in length. The electron beam is focused by means of electrostatic fields. The column is designed for a maximum voltage of 50 kV. Simulations of the electron trajectories have been performed by using the 2-D simulation code IGUN and EGUN. The electron temperature has also been incorporated into the simulations. The electron beam simulations, column design and fabrication will be discussed in this presentation.

  19. Pulsed ion beam source

    DOE Patents [OSTI]

    Greenly, John B.

    1996-01-01

    An improved magnetically-confined anode plasma pulsed ion beam source. Beam rotation effects and power efficiency are improved by a magnetic design which places the separatrix between the fast field flux structure and the slow field structure near the anode of the ion beam source, by a gas port design which localizes the gas delivery into the gap between the fast coil and the anode, by a pre-ionizer ringing circuit connected to the fast coil, and by a bias field means which optimally adjusts the plasma formation position in the ion beam source.

  20. Ion-beam technologies

    SciTech Connect (OSTI)

    Fenske, G.R.

    1993-01-01

    This compilation of figures and diagrams reviews processes for depositing diamond/diamond-like carbon films. Processes addressed are chemical vapor deposition (HFCVD, PACVD, etc.), plasma vapor deposition (plasma sputtering, ion beam sputtering, evaporation, etc.), low-energy ion implantation, and hybrid processes (biased sputtering, IBAD, biased HFCVD, etc.). The tribological performance of coatings produced by different means is discussed.

  1. Ion beam generating apparatus

    DOE Patents [OSTI]

    Brown, Ian G.; Galvin, James

    1987-01-01

    An ion generating apparatus utilizing a vacuum chamber, a cathode and an anode in the chamber. A source of electrical power produces an arc or discharge between the cathode and anode. The arc is sufficient to vaporize a portion of the cathode to form a plasma. The plasma is directed to an extractor which separates the electrons from the plasma, and accelerates the ions to produce an ion beam.

  2. Ion beam generating apparatus

    DOE Patents [OSTI]

    Brown, I.G.; Galvin, J.

    1987-12-22

    An ion generating apparatus utilizing a vacuum chamber, a cathode and an anode in the chamber. A source of electrical power produces an arc or discharge between the cathode and anode. The arc is sufficient to vaporize a portion of the cathode to form a plasma. The plasma is directed to an extractor which separates the electrons from the plasma, and accelerates the ions to produce an ion beam. 10 figs.

  3. Ion Beam Simulator

    Energy Science and Technology Software Center (OSTI)

    2005-11-08

    IBSimu(Ion Beam Simulator) is a computer program for making two and three dimensional ion optical simulations. The program can solve electrostatic field in a rectangular mesh using Poisson equation using Finite Difference method (FDM). The mesh can consist of a coarse and a fine part so that the calculation accuracy can be increased in critical areas of the geometry, while most of the calculation is done quickly using the coarse mesh. IBSimu can launch ionmore » beam trajectories into the simulation from an injection surface or fomo plasma. Ion beam space charge of time independent simulations can be taken in account using Viasov iteration. Plasma is calculated by compensating space charge with electrons having Boltzmann energy distribution. The simulation software can also be used to calculate time dependent cases if the space charge is not calculated. Software includes diagnostic tools for plotting the geometry, electric field, space charge map, ion beam trajectories, emittance data and beam profiles.« less

  4. Ion beam lithography system

    DOE Patents [OSTI]

    Leung, Ka-Ngo

    2005-08-02

    A maskless plasma-formed ion beam lithography tool provides for patterning of sub-50 nm features on large area flat or curved substrate surfaces. The system is very compact and does not require an accelerator column and electrostatic beam scanning components. The patterns are formed by switching beamlets on or off from a two electrode blanking system with the substrate being scanned mechanically in one dimension. This arrangement can provide a maskless nano-beam lithography tool for economic and high throughput processing.

  5. Pulsed ion beam source

    DOE Patents [OSTI]

    Greenly, J.B.

    1997-08-12

    An improved pulsed ion beam source is disclosed having a new biasing circuit for the fast magnetic field. This circuit provides for an initial negative bias for the field created by the fast coils in the ion beam source which pre-ionize the gas in the source, ionize the gas and deliver the gas to the proper position in the accelerating gap between the anode and cathode assemblies in the ion beam source. The initial negative bias improves the interaction between the location of the nulls in the composite magnetic field in the ion beam source and the position of the gas for pre-ionization and ionization into the plasma as well as final positioning of the plasma in the accelerating gap. Improvements to the construction of the flux excluders in the anode assembly are also accomplished by fabricating them as layered structures with a high melting point, low conductivity material on the outsides with a high conductivity material in the center. 12 figs.

  6. Maskless, resistless ion beam lithography

    SciTech Connect (OSTI)

    Ji, Qing

    2003-03-10

    As the dimensions of semiconductor devices are scaled down, in order to achieve higher levels of integration, optical lithography will no longer be sufficient for the needs of the semiconductor industry. Alternative next-generation lithography (NGL) approaches, such as extreme ultra-violet (EUV), X-ray, electron-beam, and ion projection lithography face some challenging issues with complicated mask technology and low throughput. Among the four major alternative NGL approaches, ion beam lithography is the only one that can provide both maskless and resistless patterning. As such, it can potentially make nano-fabrication much simpler. This thesis investigates a focused ion beam system for maskless, resistless patterning that can be made practical for high-volume production. In order to achieve maskless, resistless patterning, the ion source must be able to produce a variety of ion species. The compact FIB system being developed uses a multicusp plasma ion source, which can generate ion beams of various elements, such as O{sub 2}{sup +}, BF{sub 2}{sup +}, P{sup +} etc., for surface modification and doping applications. With optimized source condition, around 85% of BF{sub 2}{sup +}, over 90% of O{sub 2}{sup +} and P{sup +} have been achieved. The brightness of the multicusp-plasma ion source is a key issue for its application to maskless ion beam lithography. It can be substantially improved by optimizing the source configuration and extractor geometry. Measured brightness of 2 keV He{sup +} beam is as high as 440 A/cm{sup 2} {center_dot} Sr, which represents a 30x improvement over prior work. Direct patterning of Si thin film using a focused O{sub 2}{sup +} ion beam has been investigated. A thin surface oxide film can be selectively formed using 3 keV O{sub 2}{sup +} ions with the dose of 10{sup 15} cm{sup -2}. The oxide can then serve as a hard mask for patterning of the Si film. The process flow and the experimental results for directly patterned poly-Si features

  7. Anomalous resistivity effect on multiple ion beam emission and hard x-ray generation in a Mather type plasma focus device

    SciTech Connect (OSTI)

    Behbahani, R. A.; Aghamir, F. M.

    2011-10-15

    Multi ion beam and hard x-ray emissions were detected in a high inductance (more than 100 nH) Mather type plasma focus (PF) device at different filling gas pressures and charging voltages. The signal analysis was performed through the current trace, as it is the fundamental signal from which all of the phenomena in a PF device can be extracted. Two different fitting processes were carried out according to Lee's computational (snow-plow) model. In the first process, only plasma dynamics and classical (Spitzer) resistances were considered as energy consumer parameters for plasma. This led to an unsuccessful fitting and did not answer the energy transfer mechanism into plasma. A second fitting process was considered through the addition of anomalous resistance, which provided the best fit. Anomalous resistance was the source of long decrease in current trace, and multi dips and multi peaks of high voltage probe. Multi-peak features were interpreted considering the second fitting process along with the mechanisms for ion beam production and hard x-ray emission. To show the important role of the anomalous resistance, the duration of the current drop was discussed.

  8. Chemical Imaging Analysis of Environmental Particles Using the Focused Ion Beam/Scanning Electron Microscopy Technique: Microanalysis Insights into Atmospheric Chemistry of Fly Ash

    SciTech Connect (OSTI)

    Chen, Haihan; Grassian, Vicki H.; Saraf, Laxmikant V.; Laskin, Alexander

    2013-01-21

    Airborne fly ash from coal combustion may represent a source of bioavailable iron (Fe) in the open ocean. However, few studies have been made focusing on Fe speciation and distribution in coal fly ash. In this study, chemical imaging of fly ash has been performed using a dual-beam FIB/SEM (focused ion beam/scanning electron microscope) system for a better understanding of how simulated atmospheric processing modify the morphology, chemical compositions and element distributions of individual particles. A novel approach has been applied for cross-sectioning of fly ash specimen with a FIB in order to explore element distribution within the interior of individual particles. Our results indicate that simulated atmospheric processing causes disintegration of aluminosilicate glass, a dominant material in fly ash particles. Aluminosilicate-phase Fe in the inner core of fly ash particles is more easily mobilized compared with oxide-phase Fe present as surface aggregates on fly ash spheres. Fe release behavior depends strongly on Fe speciation in aerosol particles. The approach for preparation of cross-sectioned specimen described here opens new opportunities for particle microanalysis, particular with respect to inorganic refractive materials like fly ash and mineral dust.

  9. Towards sub-200 nm nano-structuring of linear giant magneto-resistive spin valves by a direct focused ion beam milling process

    SciTech Connect (OSTI)

    Riedmüller, Benjamin; Huber, Felix; Herr, Ulrich

    2014-02-14

    In this work, we present a detailed investigation of a focused ion beam (FIB) assisted nano-structuring process for giant magneto-resistive (GMR) spin valve sensors. We have performed a quantitative study of the dependence of the GMR ratio as well as the sensor resistance on the ion dose, which is implanted in the active region of our sensors. These findings are correlated with the decrease of magneto-resistive properties after micro- and nano-structuring by the FIB and reveal the importance of ion damage which limits the applicability of FIB milling to GMR devices in the low μm range. Deposition of a protective layer (50 nm SiO{sub 2}) on top of the sensor structure before milling leads to a preservation of the magneto-resistive properties after the milling procedure down to sensor dimensions of ∼300 nm. The reduction of the sensor dimensions to the nanometer regime is accompanied by a shift of the GMR curves, and a modification of the saturation behavior. Both effects can be explained by a micromagnetic model including the magnetic interaction of free and pinned layer as well as the effect of the demagnetizing field of the free layer on the sensor behavior. The results demonstrate that the FIB technology can be successfully used to prepare spintronic nanostructures.

  10. Ion beam processing of advanced electronic materials

    SciTech Connect (OSTI)

    Cheung, N.W.; Marwick, A.D.; Roberto, J.B. (eds.) (California Univ., Berkeley, CA (USA); International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center; Oak Ridge National Lab., TN (USA))

    1989-01-01

    This report contains research programs discussed at the materials research society symposia on ion beam processing of advanced electronic materials. Major topics include: shallow implantation and solid-phase epitaxy; damage effects; focused ion beams; MeV implantation; high-dose implantation; implantation in III-V materials and multilayers; and implantation in electronic materials. Individual projects are processed separately for the data bases. (CBS)

  11. Electrostatic plasma lens for focusing negatively charged particle beams

    SciTech Connect (OSTI)

    Goncharov, A. A.; Dobrovolskiy, A. M.; Dunets, S. M.; Litovko, I. V.; Gushenets, V. I.; Oks, E. M.

    2012-02-15

    We describe the current status of ongoing research and development of the electrostatic plasma lens for focusing and manipulating intense negatively charged particle beams, electrons, and negative ions. The physical principle of this kind of plasma lens is based on magnetic isolation electrons providing creation of a dynamical positive space charge cloud in shortly restricted volume propagating beam. Here, the new results of experimental investigations and computer simulations of wide-aperture, intense electron beam focusing by plasma lens with positive space charge cloud produced due to the cylindrical anode layer accelerator creating a positive ion stream towards an axis system is presented.

  12. Electron beam ion source and electron beam ion trap (invited)

    SciTech Connect (OSTI)

    Becker, Reinard [Scientific Software Service, Kapellenweg 2a, D-63571 Gelnhausen (Germany); Kester, Oliver [National Superconducting Cyclotron Laboratory, Michigan State University, East Lansing, Michigan 48824 (United States)

    2010-02-15

    The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades. In contrast to most other ion sources the recipe of improvement was not ''sorcery'' but a clear understanding of the physical laws and obeying the technological constraints. This review will report important achievements of the past as well as promising developments in the future.

  13. ION BEAM COLLIMATOR

    DOE Patents [OSTI]

    Langsdorf, A.S. Jr.

    1957-11-26

    A device is described for defining a beam of high energy particles wherein the means for defining the beam in the horizontal and vertical dimension are separately adjustable and the defining members are internally cooled. In general, the device comprises a mounting block having a central opening through which the beam is projected, means for rotatably supporting two pairs of beam- forming members, passages in each member for the flow of coolant; the beam- forming members being insulated from each other and the block, and each having an end projecting into the opening. The beam-forming members are adjustable and may be cooperatively positioned to define the beam passing between the end of the members. To assist in projecting and defining the beam, the member ends have individual means connected thereto for indicating the amount of charge collected thereon due to beam interception.

  14. Graphene engineering by neon ion beams

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Iberi, Vighter; Ievlev, Anton V.; Vlassiouk, Ivan; Jesse, Stephen; Kalinin, Sergei V.; Joy, David C.; Rondinone, Adam J.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-02-18

    Achieving the ultimate limits of materials and device performance necessitates the engineering of matter with atomic, molecular, and mesoscale fidelity. While common for organic and macromolecular chemistry, these capabilities are virtually absent for 2D materials. In contrast to the undesired effect of ion implantation from focused ion beam (FIB) lithography with gallium ions, and proximity effects in standard e-beam lithography techniques, the shorter mean free path and interaction volumes of helium and neon ions offer a new route for clean, resist free nanofabrication. Furthermore, with the advent of scanning helium ion microscopy, maskless He+ and Ne+ beam lithography of graphenemore » based nanoelectronics is coming to the forefront. Here, we will discuss the use of energetic Ne ions in engineering graphene devices and explore the mechanical, electromechanical and chemical properties of the ion-milled devices using scanning probe microscopy (SPM). By using SPM-based techniques such as band excitation (BE) force modulation microscopy, Kelvin probe force microscopy (KPFM) and Raman spectroscopy, we demonstrate that the mechanical, electrical and optical properties of the exact same devices can be quantitatively extracted. Additionally, the effect of defects inherent in ion beam direct-write lithography, on the overall performance of the fabricated devices is elucidated.« less

  15. Gated beam imager for heavy ion beams

    SciTech Connect (OSTI)

    Ahle, Larry; Hopkins, Harvey S.

    1998-12-10

    As part of the work building a small heavy-ion induction accelerator ring, or recirculator, at Lawrence Livermore National Laboratory, a diagnostic device measuring the four-dimensional transverse phase space of the beam in just a single pulse has been developed. This device, the Gated Beam Imager (GBI), consists of a thin plate filled with an array of 100-micron diameter holes and uses a Micro Channel Plate (MCP), a phosphor screen, and a CCD camera to image the beam particles that pass through the holes after they have drifted for a short distance. By time gating the MCP, the time evolution of the beam can also be measured, with each time step requiring a new pulse.

  16. Gated beam imager for heavy ion beams

    SciTech Connect (OSTI)

    Ahle, L.; Hopkins, H.S.

    1998-12-01

    As part of the work building a small heavy-ion induction accelerator ring, or recirculator, at Lawrence Livermore National Laboratory, a diagnostic device measuring the four-dimensional transverse phase space of the beam in just a single pulse has been developed. This device, the Gated Beam Imager (GBI), consists of a thin plate filled with an array of 100-micron diameter holes and uses a Micro Channel Plate (MCP), a phosphor screen, and a CCD camera to image the beam particles that pass through the holes after they have drifted for a short distance. By time gating the MCP, the time evolution of the beam can also be measured, with each time step requiring a new pulse. {copyright} {ital 1998 American Institute of Physics.}

  17. Ion beam requirements for fast ignition of inertial fusion targets

    SciTech Connect (OSTI)

    Honrubia, J. J.; Murakami, M.

    2015-01-15

    Ion beam requirements for fast ignition are investigated by numerical simulation taking into account new effects, such as ion beam divergence, not included before. We assume that ions are generated by the TNSA scheme in a curved foil placed inside a re-entrant cone and focused on the cone apex or beyond. From the focusing point to the compressed core, ions propagate with a given divergence angle. Ignition energies are obtained for two compressed fuel configurations heated by proton and carbon ion beams. The dependence of the ignition energies on the beam divergence angle and on the position of the ion beam focusing point has been analyzed. Comparison between TNSA and quasi-monoenergetic ions is also shown.

  18. Multiple Electron Stripping of Heavy Ion Beams

    SciTech Connect (OSTI)

    D. Mueller; L. Grisham; I. Kaganovich; R. L. Watson; V. Horvat; K. E. Zaharakis; Y. Peng

    2002-06-25

    One approach being explored as a route to practical fusion energy uses heavy ion beams focused on an indirect drive target. Such beams will lose electrons while passing through background gas in the target chamber, and therefore it is necessary to assess the rate at which the charge state of the incident beam evolves on the way to the target. Accelerators designed primarily for nuclear physics or high energy physics experiments utilize ion sources that generate highly stripped ions in order to achieve high energies economically. As a result, accelerators capable of producing heavy ion beams of 10 to 40 Mev/amu with charge state 1 currently do not exist. Hence, the stripping cross-sections used to model the performance of heavy ion fusion driver beams have, up to now, been based upon theoretical calculations. We have investigated experimentally the stripping of 3.4 Mev/amu Kr 7+ and Xe +11 in N2; 10.2 MeV/amu Ar +6 in He, N2, Ar and Xe; 19 MeV/amu Ar +8 in He, N2, Ar and Xe; 30 MeV He 1 + in He, N2, Ar and Xe; and 38 MeV/amu N +6 in He, N2, Ar and Xe. The results of these measurements are compared with the theoretical calculations to assess their applicability over a wide range of parameters.

  19. Ion Beam Neutralization by a Tenuous Background Plasma ---- Inventors Igor

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Kaganovich and William Berdanier | Princeton Plasma Physics Lab Ion Beam Neutralization by a Tenuous Background Plasma ---- Inventors Igor Kaganovich and William Berdanier The neutralization and focusing of intense charged particle beam pulses by electrons form the basis for a wide range of applications for accelerators, heavy ion fusion, and astrophysics. This invention shows that for intense ion beam pulses, a background plasma with a low relative density can be used to effectively

  20. High Power Hydrogen Injector with Beam Focusing for Plasma Heating

    SciTech Connect (OSTI)

    Deichuli, P.P.; Ivanov, A.A.; Korepanov, S.A.; Mishagin, V.V.; Sorokin, A.V.; Stupishin, N.V

    2005-01-15

    High power neutral beam injector has been developed with the atom energy of 25 keV, a current of 60 A, and several milliseconds pulse duration. Six of these injectors will be used for upgrade of the atomic injection system at central cell of a Gas Dynamic Trap (GDT) device and 2 injectors are planned for SHIP experiment.The injector ion source is based on an arc discharge plasma box. The plasma emitter is produced by a 1 kA arc discharge in hydrogen. A multipole magnetic field produced with permanent magnets at the periphery of the plasma box is used to increase its efficiency and improve homogeneity of the plasma emitter. The ion beam is extracted by a 4-electrodes ion optical system (IOS). Initial beam diameter is 200 mm. The grids of the IOS have a spherical curvature for geometrical focusing of the beam. The optimal IOS geometry and grid potentials were found with the numerical simulation to provide precise beam formation. The measured angular divergence of the beam is 0.02 rad, which corresponds to the 2.5 cm Gaussian radius of the beam profile measured at focal point.

  1. Study of a final focus system for high intensity beams

    SciTech Connect (OSTI)

    Henestroza, Enrique; Eylon, Shmuel; Roy, Prabir K.; Yu, Simon S.; Bieniosek, Frank M.; Shuman, Derek B.; Waldron, William L.

    2004-06-01

    The NTX experiment at the Heavy Ion Fusion Virtual National Laboratory is exploring the performance of neutralized final focus systems for high perveance heavy ion beams. The final focus scenario in an HIF driver consists of several large aperture quadrupole magnets followed by a drift section in which the beam space charge is neutralized by a plasma. This beam is required to hit a millimeter-sized target spot at the end of the drift section. The objective of the NTX experiments and associated theory and simulations is to study the various physical mechanisms that determine the final spot size (radius r{sub s}) at a given distance (f) from the end of the last quadrupole. In a fusion driver, f is the standoff distance required to keep the chamber wall and superconducting magnets properly protected. The NTX final quadrupole focusing system produces a converging beam at the entrance to the neutralized drift section where it focuses to a small spot. The final spot is determined by the conditions of the beam entering the quadrupole section, the beam dynamics in the magnetic lattice, and the plasma neutralization dynamics in the drift section. The main issues are the control of emittance growth due to high order fields from magnetic multipoles and image fields. In this paper, we will describe the theoretical and experimental aspects of the beam dynamics in the quadrupole lattice, and how these physical effects influence the final beam size. In particular, we present theoretical and experimental results on the dependence of final spot size on geometric aberrations and perveance.

  2. Oxygen ion-beam microlithography

    DOE Patents [OSTI]

    Tsuo, Y. Simon

    1991-01-01

    A method of providing and developing a resist on a substrate for constructing integrated circuit (IC) chips includes the following steps: of depositing a thin film of amorphous silicon or hydrogenated amorphous silicon on the substrate and exposing portions of the amorphous silicon to low-energy oxygen ion beams to oxidize the amorphous silicon at those selected portions. The nonoxidized portions are then removed by etching with RF-excited hydrogen plasma. Components of the IC chip can then be constructed through the removed portions of the resist. The entire process can be performed in an in-line vacuum production system having several vacuum chambers. Nitrogen or carbon ion beams can also be used.

  3. Oxygen ion-beam microlithography

    DOE Patents [OSTI]

    Tsuo, Y.S.

    1991-08-20

    A method of providing and developing a resist on a substrate for constructing integrated circuit (IC) chips includes the following steps: of depositing a thin film of amorphous silicon or hydrogenated amorphous silicon on the substrate and exposing portions of the amorphous silicon to low-energy oxygen ion beams to oxidize the amorphous silicon at those selected portions. The nonoxidized portions are then removed by etching with RF-excited hydrogen plasma. Components of the IC chip can then be constructed through the removed portions of the resist. The entire process can be performed in an in-line vacuum production system having several vacuum chambers. Nitrogen or carbon ion beams can also be used. 5 figures.

  4. Ion beam inertial confinement target

    DOE Patents [OSTI]

    Bangerter, Roger O.; Meeker, Donald J.

    1985-01-01

    A target for implosion by ion beams composed of a spherical shell of frozen DT surrounded by a low-density, low-Z pusher shell seeded with high-Z material, and a high-density tamper shell. The target has various applications in the inertial confinement technology. For certain applications, if desired, a low-density absorber shell may be positioned intermediate the pusher and tamper shells.

  5. Superconducting focusing quadrupoles for heavy ion fusion experiments

    SciTech Connect (OSTI)

    Sabbi, G.L.; Faltens, A.; Leitner, M.; Lietzke, A.; Seidl, P.; Barnard, J.; Lund, S.; Martovetsky, N.; Gung, C.; Minervini, J.; Radovinsky, A.; Schultz, J.; Meinke, R.

    2003-05-01

    The Heavy Ion Fusion (HIF) Program is developing superconducting focusing magnets for both near-term experiments and future driver accelerators. In particular, single bore quadrupoles have been fabricated and tested for use in the High Current Experiment (HCX) at Lawrence Berkeley National Laboratory (LBNL). The next steps involve the development of magnets for the planned Integrated Beam Experiment (IBX) and the fabrication of the first prototype multi-beam focusing arrays for fusion driver accelerators. The status of the magnet R&D program is reported, including experimental requirements, design issues and test results.

  6. Laser induced focusing for over-dense plasma beams

    SciTech Connect (OSTI)

    Schmidt, Peter; Boine-Frankenheim, Oliver; Mulser, Peter

    2015-09-15

    The capability of ion acceleration with high power, pulsed lasers has become an active field of research in the past years. In this context, the radiation pressure acceleration (RPA) mechanism has been the topic of numerous theoretical and experimental publications. Within that mechanism, a high power, pulsed laser beam hits a thin film target. In contrast to the target normal sheath acceleration, the entire film target is accelerated as a bulk by the radiation pressure of the laser. Simulations predict heavy ion beams with kinetic energy up to GeV, as well as solid body densities. However, there are several effects which limit the efficiency of the RPA: On the one hand, the Rayleigh-Taylor-instability limits the predicted density. On the other hand, conventional accelerator elements, such as magnetic focusing devices are too bulky to be installed right after the target. Therefore, we present a new beam transport method, suitable for RPA-like/over-dense plasma beams: laser induced focusing.

  7. Pseudo ribbon metal ion beam source

    SciTech Connect (OSTI)

    Stepanov, Igor B. Ryabchikov, Alexander I.; Sivin, Denis O.; Verigin, Dan A.

    2014-02-15

    The paper describes high broad metal ion source based on dc macroparticle filtered vacuum arc plasma generation with the dc ion-beam extraction. The possibility of formation of pseudo ribbon beam of metal ions with the parameters: ion beam length 0.6 m, ion current up to 0.2 A, accelerating voltage 40 kV, and ion energy up to 160 kV has been demonstrated. The pseudo ribbon ion beam is formed from dc vacuum arc plasma. The results of investigation of the vacuum arc evaporator ion-emission properties are presented. The influence of magnetic field strength near the cathode surface on the arc spot movement and ion-emission properties of vacuum-arc discharge for different cathode materials are determined. It was shown that vacuum-arc discharge stability can be reached when the magnetic field strength ranges from 40 to 70 G on the cathode surface.

  8. Note: High density pulsed molecular beam for cold ion chemistry

    SciTech Connect (OSTI)

    Kokish, M. G.; Rajagopal, V.; Marler, J. P.; Odom, B. C.

    2014-08-15

    A recent expansion of cold and ultracold molecule applications has led to renewed focus on molecular species preparation under ultrahigh vacuum conditions. Meanwhile, molecular beams have been used to study gas phase chemical reactions for decades. In this paper, we describe an apparatus that uses pulsed molecular beam technology to achieve high local gas densities, leading to faster reaction rates with cold trapped ions. We characterize the beam's spatial profile using the trapped ions themselves. This apparatus could be used for preparation of molecular species by reactions requiring excitation of trapped ion precursors to states with short lifetimes or for obtaining a high reaction rate with minimal increase of background chamber pressure.

  9. Plasma formed ion beam projection lithography system

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Lee, Yung-Hee Yvette; Ngo, Vinh; Zahir, Nastaran

    2002-01-01

    A plasma-formed ion-beam projection lithography (IPL) system eliminates the acceleration stage between the ion source and stencil mask of a conventional IPL system. Instead a much thicker mask is used as a beam forming or extraction electrode, positioned next to the plasma in the ion source. Thus the entire beam forming electrode or mask is illuminated uniformly with the source plasma. The extracted beam passes through an acceleration and reduction stage onto the resist coated wafer. Low energy ions, about 30 eV, pass through the mask, minimizing heating, scattering, and sputtering.

  10. The Electron Beam Ion Source (EBIS)

    ScienceCinema (OSTI)

    Brookhaven Lab

    2010-01-08

    Brookhaven National Lab has successfully developed a new pre-injector system, called the Electron Beam Ion Source, for the Relativistic Heavy Ion Collider (RHIC) and NASA Space Radiation Laboratory science programs. The first of several planned improvemen

  11. Ion optics of RHIC electron beam ion source

    SciTech Connect (OSTI)

    Pikin, A.; Alessi, J.; Beebe, E.; Kponou, A.; Okamura, M.; Raparia, D.; Ritter, J.; Tan, Y.; Kuznetsov, G.

    2012-02-15

    RHIC electron beam ion source has been commissioned to operate as a versatile ion source on RHIC injection facility supplying ion species from He to Au for Booster. Except for light gaseous elements RHIC EBIS employs ion injection from several external primary ion sources. With electrostatic optics fast switching from one ion species to another can be done on a pulse to pulse mode. The design of an ion optical structure and the results of simulations for different ion species are presented. In the choice of optical elements special attention was paid to spherical aberrations for high-current space charge dominated ion beams. The combination of a gridded lens and a magnet lens in LEBT provides flexibility of optical control for a wide range of ion species to satisfy acceptance parameters of RFQ. The results of ion transmission measurements are presented.

  12. Electrostatic ion beam trap for electron collision studies

    SciTech Connect (OSTI)

    Heber, O.; Witte, P.D.; Diner, A.; Bhushan, K.G.; Strasser, D.; Toker, Y.; Rappaport, M.L.; Ben-Itzhak, I.; Altstein, N.; Schwalm, D.; Wolf, A.; Zajfman, D.

    2005-01-01

    We describe a system combining an ion beam trap and a low energy electron target in which the interaction between electrons and vibrationally cold molecular ions and clusters can be studied. The entire system uses only electrostatic fields for both trapping and focusing, thus being able to store particles without a mass limit. Preliminary results for the electron impact neutralization of C{sub 2}{sup -} ions and aluminum clusters are presented.

  13. Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Auden, Elizabeth C.; Pacheco, Jose L.; Bielejec, Edward; Vizkelethy, Gyorgy; Abraham, John B. S.; Doyle, Barney L.

    2015-12-01

    In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si++ ions and 60 keV Li+ ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

  14. Sub-micron resolution of localized ion beam induced charge reduction in silicon detectors damaged by heavy ions

    SciTech Connect (OSTI)

    Auden, Elizabeth C.; Pacheco, Jose L.; Bielejec, Edward; Vizkelethy, Gyorgy; Abraham, John B. S.; Doyle, Barney L.

    2015-12-01

    In this study, displacement damage reduces ion beam induced charge (IBIC) through Shockley-Read-Hall recombination. Closely spaced pulses of 200 keV Si++ ions focused in a 40 nm beam spot are used to create damage cascades within 0.25 μm2 areas. Damaged areas are detected through contrast in IBIC signals generated with focused ion beams of 200 keV Si++ ions and 60 keV Li+ ions. IBIC signal reduction can be resolved over sub-micron regions of a silicon detector damaged by as few as 1000 heavy ions.

  15. Beam-beam observations in the Relativistic Heavy Ion Collider

    SciTech Connect (OSTI)

    Luo, Y.; Fischer, W.; White, S.

    2015-06-24

    The Relativistic Heavy Ion Collider (RHIC) at Brookhaven National Laboratory has been operating since 2000. Over the past decade, thanks to the continuously increased bunch intensity and reduced β*s at the interaction points, the maximum peak luminosity in the polarized proton operation has been increased by more than two orders of magnitude. In this article, we first present the beam-beam observations in the previous RHIC polarized proton runs. Then we analyze the mechanisms for the beam loss and emittance growth in the presence of beam-beam interaction. The operational challenges and limitations imposed by beam-beam interaction and their remedies are also presented. In the end, we briefly introduce head-on beam-beam compensation with electron lenses in RHIC.

  16. Intense Ion Beam for Warm Dense Matter Physics

    SciTech Connect (OSTI)

    Coleman, Joshua Eugene

    2008-05-23

    The Neutralized Drift Compression Experiment (NDCX) at Lawrence Berkeley National Laboratory is exploring the physical limits of compression and focusing of ion beams for heating material to warm dense matter (WDM) and fusion ignition conditions. The NDCX is a beam transport experiment with several components at a scale comparable to an inertial fusion energy driver. The NDCX is an accelerator which consists of a low-emittance ion source, high-current injector, solenoid matching section, induction bunching module, beam neutralization section, and final focusing system. The principal objectives of the experiment are to control the beam envelope, demonstrate effective neutralization of the beam space-charge, control the velocity tilt on the beam, and understand defocusing effects, field imperfections, and limitations on peak intensity such as emittance and aberrations. Target heating experiments with space-charge dominated ion beams require simultaneous longitudinal bunching and transverse focusing. A four-solenoid lattice is used to tune the beam envelope to the necessary focusing conditions before entering the induction bunching module. The induction bunching module provides a head-to-tail velocity ramp necessary to achieve peak axial compression at the desired focal plane. Downstream of the induction gap a plasma column neutralizes the beam space charge so only emittance limits the focused beam intensity. We present results of beam transport through a solenoid matching section and simultaneous focusing of a singly charged K{sup +} ion bunch at an ion energy of 0.3 MeV. The results include a qualitative comparison of experimental and calculated results after the solenoid matching section, which include time resolved current density, transverse distributions, and phase-space of the beam at different diagnostic planes. Electron cloud and gas measurements in the solenoid lattice and in the vicinity of intercepting diagnostics are also presented. Finally, comparisons

  17. Beam imaging diagnostics for heavy ion beam fusion experiments

    SciTech Connect (OSTI)

    Bieniosek, F.M.; Prost, L.; Ghiorso, W.

    2003-05-01

    We are developing techniques for imaging beams in heavy-ion beam fusion experiments in the HIF-VNL in 2 to 4 transverse dimensions. The beams in current experiments range in energy from 50 keV to 2 MeV, with beam current densities from <10 to 200 mA/cm{sup 2}, and pulse lengths of 4 to 20 {micro}s. The beam energy will range up to 10 MeV in near-future beam experiments. The imaging techniques, based on kapton films and optical scintillators, complement and, in some cases, may replace mechanical slit scanners. The kapton film images represent a time-integrated image on the film exposed to the beam. The optical scintillator utilizes glass and ceramic scintillator material imaged by a fast, image-intensified CCD-based camera. We will discuss the techniques, results, and plans for implementation of the diagnostics on the beam experiments.

  18. Medical applications of nuclear physics and heavy-ion beams ...

    Office of Scientific and Technical Information (OSTI)

    Conference: Medical applications of nuclear physics and heavy-ion beams Citation Details In-Document Search Title: Medical applications of nuclear physics and heavy-ion beams ...

  19. Effects of Ion Beam on Nanoindentation Characteristics of Glassy...

    Office of Scientific and Technical Information (OSTI)

    Effects of Ion Beam on Nanoindentation Characteristics of Glassy Polymeric Carbon Surface Citation Details In-Document Search Title: Effects of Ion Beam on Nanoindentation ...

  20. Evaluation of Negative-Ion-Beam Driver Concepts for Heavy Ion Fusion

    SciTech Connect (OSTI)

    Grisham, Larry R.

    2003-03-15

    The feasibility of producing and using atomically neutral heavy ion beams produced from negative ions as drivers for an inertial confinement fusion reactor is evaluated. Bromine and iodine appear to be the most attractive elements for the driver beams. Fluorine and chlorine appear to be the most appropriate feedstocks for initial tests of extractable negative-ion current densities. With regard to ion sources, photodetachment neutralizers, and vacuum requirements for accelerators and beam transport, this approach appears feasible within existing technology, and the vacuum requirements are essentially identical to those for positive-ion drivers except in the target chamber. The principal constraint is that this approach requires harder vacuums in the target chamber than do space-charge-neutralized positive-ion drivers. With realistic (but perhaps pessimistic) estimates of the total ionization cross section, limiting the ionization of a neutral beam to <5% while traversing a 3-m path would require a chamber pressure of no more than 1.3 x 10{sup -5} torr. However, it appears that substantial improvements in the beam spot size on target might be achieved at pressures a factor of 10 or more higher than this. Alternatively, even at still higher chamber pressures that would strongly ionize atomically neutral beams, the negative-ion approach may still have significant appeal, since it precludes the possibly challenging problem of electron contamination of a positive-ion beam during acceleration, drift compression, and focusing.

  1. Confined ion beam sputtering device and method

    DOE Patents [OSTI]

    Sharp, D.J.

    1986-03-25

    A hollow cylindrical target, lined internally with a sputter deposit material and open at both ends, surrounds a substrate on which sputtered deposition is to be obtained. An ion beam received through either one or both ends of the open cylindrical target is forced by a negative bias applied to the target to diverge so that ions impinge at acute angles at different points of the cylindrical target surface. The ion impingement results in a radially inward and downstream directed flux of sputter deposit particles that are received by the substrate. A positive bias applied to the substrate enhances divergence of the approaching ion beams to generate a higher sputtered deposition flux rate. Alternatively, a negative bias applied to the substrate induces the core portion of the ion beams to reach the substrate and provide ion polishing of the sputtered deposit thereon.

  2. Confined ion beam sputtering device and method

    DOE Patents [OSTI]

    Sharp, Donald J.

    1988-01-01

    A hollow cylindrical target, lined internally with a sputter deposit material and open at both ends, surrounds a substrate on which sputtered deposition is to be obtained. An ion beam received through either one or both ends of the open cylindrical target is forced by a negative bias applied to the target to diverge so that ions impinge at acute angles at different points of the cylindrical target surface. The ion impingement results in a radially inward and downstream directed flux of sputter deposit particles that are received by the substrate. A positive bias applied to the substrate enhances divergence of the approaching ion beams to generate a higher sputtered deposition flux rate. Alternatively, a negative bias applied to the substrate induces the core portion of the ion beams to reach the substrate and provide ion polishing of the sputtered deposit thereon.

  3. Flow-through ion beam source

    DOE Patents [OSTI]

    Springer, R.W.

    1997-02-11

    A method and an apparatus for forming a charge neutral ion beam which is useful in producing thin films of material on electrically conductive or non-conductive substrates are provided. 4 figs.

  4. Flow-through ion beam source

    DOE Patents [OSTI]

    Springer, Robert W.

    1997-01-01

    A method and an apparatus for forming a charge neutral ion beam which is useful in producing thin films of material on electrically conductive or non-conductive substrates are provided.

  5. Measurements and simulations of focused beam for orthovoltage therapy

    SciTech Connect (OSTI)

    Abbas, Hassan; Mahato, Dip N.; Satti, Jahangir; MacDonald, C. A.

    2014-04-15

    Purpose: Megavoltage photon beams are typically used for therapy because of their skin-sparing effect. However, a focused low-energy x-ray beam would also be skin sparing, and would have a higher dose concentration at the focal spot. Such a beam can be produced with polycapillary optics. MCNP5 was used to model dose profiles for a scanned focused beam, using measured beam parameters. The potential of low energy focused x-ray beams for radiation therapy was assessed. Methods: A polycapillary optic was used to focus the x-ray beam from a tungsten source. The optic was characterized and measurements were performed at 50 kV. PMMA blocks of varying thicknesses were placed between optic and the focal spot to observe any variation in the focusing of the beam after passing through the tissue-equivalent material. The measured energy spectrum was used to model the focused beam in MCNP5. A source card (SDEF) in MCNP5 was used to simulate the converging x-ray beam. Dose calculations were performed inside a breast tissue phantom. Results: The measured focal spot size for the polycapillary optic was 0.2 mm with a depth of field of 5 mm. The measured focal spot remained unchanged through 40 mm of phantom thickness. The calculated depth dose curve inside the breast tissue showed a dose peak several centimeters below the skin with a sharp dose fall off around the focus. The percent dose falls below 10% within 5 mm of the focus. It was shown that rotating the optic during scanning would preserve the skin-sparing effect of the focused beam. Conclusions: Low energy focused x-ray beams could be used to irradiate tumors inside soft tissue within 5 cm of the surface.

  6. Evaluation of Negative-Ion-Beam Driver Concepts for Heavy Ion Fusion

    SciTech Connect (OSTI)

    Larry R. Grisham

    2002-01-14

    We evaluate the feasibility of producing and using atomically neutral heavy ion beams produced from negative ions as drivers for an inertial confinement fusion reactor. Bromine and iodine appear to be the most attractive elements for the driver beams. Fluorine and chlorine appear to be the most appropriate feedstocks for initial tests of extractable negative ion current densities. With regards to ion sources, photodetachment neutralizers, and vacuum requirements for accelerators and beam transport, this approach appears feasible within existing technology, and the vacuum requirements are essentially identical to those for positive ion drivers except in the target chamber. The principal constraint is that this approach requires harder vacuums in the target chamber than do space-charge-neutralized positive ion drivers. With realistic (but perhaps pessimistic) estimates of the total ionization cross section, limiting the ionization of a neutral beam to less than 5% while traversing a four -meter path would require a chamber pressure of no more than 5 x 10{sup -5} torr. Alternatively, even at chamber pressures that are too high to allow propagation of atomically neutral beams, the negative ion approach may still have appeal, since it precludes the possibly serious problem of electron contamination of a positive ion beam during acceleration, drift compression, and focusing.

  7. Thermoacoustic imaging using heavy ion beams

    SciTech Connect (OSTI)

    Claytor, T.N.; Tesmer, J.R.; Deemer, B.C.; Murphy, J.C.

    1995-10-01

    Ion beams have been used for surface modification, semiconductor device fabrication and for material analysis, which makes ion-material interactions of significant importance. Ion implantation will produce new compositions near the surface by ion mixing or directly by implanting desired ions. Ions exchange their energy to the host material as they travel into the material by several different processes. High energy ions ionize the host atoms before atomic collisions transfer the remaining momentum and stop the incident ion. As they penetrate the surface, the low energy ions ionize the host atoms, but also have a significantly large momentum transfer mechanism near the surface of the material. This leads to atoms, groups of atoms and electrons being ejected from the surface, which is the momentum transfer process of sputtering. This talk addresses the acoustic waves generated during ion implantation using modulated heavy ion beams. The mechanisms for elastic wave generation during ion implantation, in the regimes where sputtering is significant and where implantation is dominant and sputtering is negligible, has been studied. The role of momentum transfer and thermal energy production during ion implantation was compared to laser generated elastic waves in an opaque solid as a reference, since laser generated ultrasound has been extensively studied and is fairly well understood. The thermoelastic response dominated in both high and low ion energy regimes since, apparently, more energy is lost to thermal heat producing mechanisms than momentum transfer processes. The signal magnitude was found to vary almost linearly with incident energy as in the laser thermoelastic regime. The time delays for longitudinal and shear waves-were characteristic of those expected for a purely thermal heating source. The ion beams are intrinsically less sensitive to the albedo of the surface.

  8. Beam current controller for laser ion source

    DOE Patents [OSTI]

    Okamura, Masahiro

    2014-10-28

    The present invention relates to the design and use of an ion source with a rapid beam current controller for experimental and medicinal purposes. More particularly, the present invention relates to the design and use of a laser ion source with a magnetic field applied to confine a plasma flux caused by laser ablation.

  9. Mass spectrometer and methods of increasing dispersion between ion beams

    DOE Patents [OSTI]

    Appelhans, Anthony D.; Olson, John E.; Delmore, James E.

    2006-01-10

    A mass spectrometer includes a magnetic sector configured to separate a plurality of ion beams, and an electrostatic sector configured to receive the plurality of ion beams from the magnetic sector and increase separation between the ion beams, the electrostatic sector being used as a dispersive element following magnetic separation of the plurality of ion beams. Other apparatus and methods are provided.

  10. The role of space charge compensation for ion beam extraction and ion beam transport (invited)

    SciTech Connect (OSTI)

    Spädtke, Peter

    2014-02-15

    Depending on the specific type of ion source, the ion beam is extracted either from an electrode surface or from a plasma. There is always an interface between the (almost) space charge compensated ion source plasma, and the extraction region in which the full space charge is influencing the ion beam itself. After extraction, the ion beam is to be transported towards an accelerating structure in most cases. For lower intensities, this transport can be done without space charge compensation. However, if space charge is not negligible, the positive charge of the ion beam will attract electrons, which will compensate the space charge, at least partially. The final degree of Space Charge Compensation (SCC) will depend on different properties, like the ratio of generation rate of secondary particles and their loss rate, or the fact whether the ion beam is pulsed or continuous. In sections of the beam line, where the ion beam is drifting, a pure electrostatic plasma will develop, whereas in magnetic elements, these space charge compensating electrons become magnetized. The transport section will provide a series of different plasma conditions with different properties. Different measurement tools to investigate the degree of space charge compensation will be described, as well as computational methods for the simulation of ion beams with partial space charge compensation.

  11. Study on electron beam in a low energy plasma focus

    SciTech Connect (OSTI)

    Khan, Muhammad Zubair; Ling, Yap Seong; San, Wong Chiow

    2014-03-05

    Electron beam emission was investigated in a low energy plasma focus device (2.2 kJ) using copper hollow anode. Faraday cup was used to estimate the energy of the electron beam. XR100CR X-ray spectrometer was used to explore the impact of the electron beam on the target observed from top-on and side-on position. Experiments were carried out at optimized pressure of argon gas. The impact of electron beam is exceptionally notable with two different approaches using lead target inside hollow anode in our plasma focus device.

  12. Negative-ion-based neutral beams for fusion

    SciTech Connect (OSTI)

    Cooper, W.S.; Anderson, O.A.; Chan, C.F.; Jackson, L.T.; Kunkel, W.B.; Kwan, J.W.; Leung, K.N.; Lietzke, A.F.; Purgalis, P.; Soroka, L.

    1987-10-01

    To maximize the usefulness of an engineering test reactor (e.g., ITER, TIBER), it is highly desirable that it operate under steady-state conditions. The most attractive option for maintaining the circulating current needed in the center of the plasma is the injection of powerful beams of neutral deuterium atoms. The beam simultaneously heats the plasma. At the energies required, in excess of 500 keV, such beams can be made by accelerating D/sup -/ ions and then removing the electron. Sources are being developed that generate the D/sup -/ ions in the volume of a specially constructed plasma discharge, without the addition of cesium. These sources must operate with minimum gas flow, to avoid stripping the D/sup -/ beam, and with minimum electron output. We are designing at LBL highly efficient electrostatic accelerators that combine electric strong-focusing with dc acceleration and offer the possibility of varying the beam energy at constant current while minimizing breakdown. Some form of rf acceleration may also be required. To minimize irradiation of the ion sources and accelerators, the D/sup -/ beam can be transported through a maze in the neutron shielding. The D/sup -/ ions can be converted to neutrals in a gas or plasma target, but advances in laser and mirror technology may make possible very efficient photodetachment systems by the time an ETR becomes operational. 9 refs., 4 figs.

  13. INERTIAL FUSION DRIVEN BY INTENSE HEAVY-ION BEAMS

    SciTech Connect (OSTI)

    Sharp, W. M.; Friedman, A.; Grote, D. P.; Barnard, J. J.; Cohen, R. H.; Dorf, M. A.; Lund, S. M.; Perkins, L. J.; Terry, M. R.; Logan, B. G.; Bieniosek, F. M.; Faltens, A.; Henestroza, E.; Jung, J. Y.; Kwan, J. W.; Lee, E. P.; Lidia, S. M.; Ni, P. A.; Reginato, L. L.; Roy, P. K.; Seidl, P. A.; Takakuwa, J. H.; Vay, J.-L.; Waldron, W. L.; Davidson, R. C.; Gilson, E. P.; Kaganovich, I. D.; Qin, H.; Startsev, E.; Haber, I.; Kishek, R. A.; Koniges, A. E.

    2011-03-31

    Intense heavy-ion beams have long been considered a promising driver option for inertial-fusion energy production. This paper briefly compares inertial confinement fusion (ICF) to the more-familiar magnetic-confinement approach and presents some advantages of using beams of heavy ions to drive ICF instead of lasers. Key design choices in heavy-ion fusion (HIF) facilities are discussed, particularly the type of accelerator. We then review experiments carried out at Lawrence Berkeley National Laboratory (LBNL) over the past thirty years to understand various aspects of HIF driver physics. A brief review follows of present HIF research in the US and abroad, focusing on a new facility, NDCX-II, being built at LBNL to study the physics of warm dense matter heated by ions, as well as aspects of HIF target physics. Future research directions are briefly summarized.

  14. Parametric reflection upon cascade interaction of focused optical beams

    SciTech Connect (OSTI)

    Lobanov, V E; Sukhorukov, A P; Sukhorukova, A K

    2008-10-31

    The parametric reflection of a signal beam in the waist of the reference pump beam upon mismatched three-frequency interaction in a quadratically nonlinear medium is discussed. The critical angle of total internal reflection from the induced defocusing channel is found as a function of the beam waist parameters. It is shown that when the reference beam is focused, this angle increases and some distortions are introduced into the reflected wave due to a finite length of the waist. The modification of the cross section of a wave reflected from a convex parametric mirror is analysed. The optimal beam focusing geometry is found at which the distortions of the shape and divergence of the reflected wave are minimal. Under certain conditions, the signal wave also flows around a cylindrical inhomogeneity produced by the axially symmetric pump beam. The results of theoretical analysis and numerical simulation are in good agreement. (nonlinear optical phenomena)

  15. Computational study of ion beam extraction phenomena through multiple apertures

    SciTech Connect (OSTI)

    Hu, Wanpeng; Sang, Chaofeng; Tang, Tengfei; Wang, Dezhen, E-mail: wangdez@dlut.edu.cn [Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024 (China)] [Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024 (China); Li, Ming; Jin, Dazhi; Tan, Xiaohua [Institute of Electronic Engineering, Mianyang, 621900 (China)] [Institute of Electronic Engineering, Mianyang, 621900 (China)

    2014-03-15

    The process of ion extraction through multiple apertures is investigated using a two-dimensional particle-in-cell code. We consider apertures with a fixed diameter with a hydrogen plasma background, and the trajectories of electrons, H{sup +} and H{sub 2}{sup +} ions in the self-consistently calculated electric field are traced. The focus of this work is the fundamental physics of the ion extraction, and not particular to a specific device. The computed convergence and divergence of the extracted ion beam are analyzed. We find that the extracted ion flux reaching the extraction electrode is non-uniform, and the peak flux positions change according to operational parameters, and do not necessarily match the positions of the apertures in the y-direction. The profile of the ion flux reaching the electrode is mainly affected by the bias voltage and the distance between grid wall and extraction electrode.

  16. Observations of underdense plasma lens focusing of relativistic electron beams

    SciTech Connect (OSTI)

    Thompson, M.C.; Badakov, H.; Rosenzweig, J.B.; Travish, G.; Fliller, R.; Kazakevich, G.M.; Piot, P.; Santucci, J.; Li, J.; Tikhoplav, R.; /Rochester U.

    2007-06-01

    Focusing of a 15 MeV, 19 nC electron bunch by an underdense plasma lens operated just beyond the threshold of the underdense condition has been demonstrated in experiments at the Fermilab NICADD Photoinjector Laboratory (FNPL). The strong 1.9 cm focal-length plasma-lens focused both transverse directions simultaneously and reduced the minimum area of the beam spot by a factor of 23. Analysis of the beam-envelope evolution observed near the beam waist shows that the spherical aberrations of this underdense lens are lower than those of an overdense plasma lens, as predicted by theory. Correlations between the beam charge and the properties of the beam focus corroborate this conclusion.

  17. Dense Metal Plasma in a Solenoid for Ion Beam Neutralization

    SciTech Connect (OSTI)

    Anders, Andre; Kauffeldt, Marina; Oks, Efim M.; Roy, Prabir K.

    2010-10-30

    Space-charge neutralization is required to compress and focus a pulsed, high-current ion beam on a target for warm dense matter physics or heavy ion fusion experiments. We described approaches to produce dense plasma in and near the final focusing solenoid through which the ion beam travels, thereby providing an opportunity for the beam to acquire the necessary space-charge compensating electrons. Among the options are plasma injection from pulsed vacuum arc sources located outside the solenoid, and using a high current (> 4 kA) pulsed vacuum arc plasma from a ring cathode near the edge of the solenoid. The plasma distribution is characterized by photographic means, by an array of movable Langmuir probes, by a small single probe, and by evaluating Stark broadening of the Balmer H beta spectral line. In the main approach described here, the plasma is produced at several cathode spots distributed azimuthally on the ring cathode. It is shown that the plasma is essentially hollow, as determined by the structure of the magnetic field, though the plasma density exceeds 1014 cm-3 in practically all zones of the solenoid volume if the ring electrode is placed a few centimeters off the center of the solenoid. The plasma is non-uniform and fluctuating, however, since its density exceeds the ion beam density it is believed that this approach could provide a practical solution to the space charge neutralization challenge.

  18. Microchip and wedge ion funnels and planar ion beam analyzers using same

    DOE Patents [OSTI]

    Shvartsburg, Alexandre A; Anderson, Gordon A; Smith, Richard D

    2012-10-30

    Electrodynamic ion funnels confine, guide, or focus ions in gases using the Dehmelt potential of oscillatory electric field. New funnel designs operating at or close to atmospheric gas pressure are described. Effective ion focusing at such pressures is enabled by fields of extreme amplitude and frequency, allowed in microscopic gaps that have much higher electrical breakdown thresholds in any gas than the macroscopic gaps of present funnels. The new microscopic-gap funnels are useful for interfacing atmospheric-pressure ionization sources to mass spectrometry (MS) and ion mobility separation (IMS) stages including differential IMS or FAIMS, as well as IMS and MS stages in various configurations. In particular, "wedge" funnels comprising two planar surfaces positioned at an angle and wedge funnel traps derived therefrom can compress ion beams in one dimension, producing narrow belt-shaped beams and laterally elongated cuboid packets. This beam profile reduces the ion density and thus space-charge effects, mitigating the adverse impact thereof on the resolving power, measurement accuracy, and dynamic range of MS and IMS analyzers, while a greater overlap with coplanar light or particle beams can benefit spectroscopic methods.

  19. Ion beam assisted deposition of thermal barrier coatings

    DOE Patents [OSTI]

    Youchison, Dennis L.; McDonald, Jimmie M.; Lutz, Thomas J.; Gallis, Michail A.

    2010-11-23

    Methods and apparatus for depositing thermal barrier coatings on gas turbine blades and vanes using Electron Beam Physical Vapor Deposition (EBPVD) combined with Ion Beam Assisted Deposition (IBAD).

  20. Physics with fast molecular-ion beams

    SciTech Connect (OSTI)

    Kanter, E.P.

    1980-01-01

    Fast (MeV) molecular-ion beams provide a unique source of energetic projectile nuclei which are correlated in space and time. The recognition of this property has prompted several recent investigations of various aspects of the interactions of these ions with matter. High-resolution measurements on the fragments resulting from these interactions have already yielded a wealth of new information on such diverse topics as plasma oscillations in solids and stereochemical structures of molecular ions as well as a variety of atomic collision phenomena. The general features of several such experiments will be discussed and recent results will be presented.

  1. Ion beam analysis techniques in interdisciplinary applications

    SciTech Connect (OSTI)

    Respaldiza, Miguel A.; Ager, Francisco J.

    1999-11-16

    The ion beam analysis techniques emerge in the last years as one of the main applications of electrostatic accelerators. A short summary of the most used IBA techniques will be given as well as some examples of applications in interdisciplinary sciences.

  2. MULTIPLE ELECTRON BEAM ION PUMP AND SOURCE

    DOE Patents [OSTI]

    Ellis, R.E.

    1962-02-27

    A vacuum pump is designed which operates by ionizing incoming air and by withdrawing the ions from the system by means of electrical fields. The apparatus comprises a cylindrical housing communicable with the vessel to be evacuated and having a thin wall section in one end. Suitable coils provide a longitudinal magnetic field within the cylinder. A broad cathode and an anode structure is provided to establish a plurality of adjacent electron beams which are parallel to the cylinder axis. Electron reflector means are provided so that each of the beams constitutes a PIG or reflex discharge. Such structure provides a large region in which incoming gas molecules may be ionized by electron bombardment. A charged electrode assembly accelerates the ions through the thin window, thereby removing the gas from the system. The invention may also be utilized as a highly efficient ion source. (AEC)

  3. Optimum focusing of Gaussian laser beams: Beam waist shift in spot size minimization

    SciTech Connect (OSTI)

    Li, Y.; Katz, J. )

    1994-04-01

    Optimum focusing of Gaussian laser beams is first discussed by Dickson, who described the change in beam radius under the effect of focusing system parameters. The purpose of this study is to present a formulation for calculating the waist shift under various optimum conditions. Because the variations of beam waist can be measured directly, the waist shift in a focused Gaussian beam is a more practical parameter than the movement of the intensity maximum that is the subject for investigators of the well-known focal shift problem.

  4. Silicon ion irradiation effects on the magnetic properties of ion beam synthesized CoPt phase

    SciTech Connect (OSTI)

    Balaji, S.; Amirthapandian, S.; Panigrahi, B. K.; Mangamma, G.; Kalavathi, S.; Gupta, Ajay; Nair, K. G. M.

    2012-06-05

    Ion beam mixing of Pt/Co bilayers using self ion (Pt{sup +}) beam results in formation of CoPt phase. Upon ion beam annealing the ion mixed samples using 4 MeV Si{sup +} ions at 300 deg. C, diffusion of Co towards the Pt/Co interface is observed. The Si{sup +} ion beam rotates the magnetization of the CoPt phase from in plane to out of plane of the film.

  5. High sensitivity charge amplifier for ion beam uniformity monitor

    DOE Patents [OSTI]

    Johnson, Gary W.

    2001-01-01

    An ion beam uniformity monitor for very low beam currents using a high-sensitivity charge amplifier with bias compensation. The ion beam monitor is used to assess the uniformity of a raster-scanned ion beam, such as used in an ion implanter, and utilizes four Faraday cups placed in the geometric corners of the target area. Current from each cup is integrated with respect to time, thus measuring accumulated dose, or charge, in Coulombs. By comparing the dose at each corner, a qualitative assessment of ion beam uniformity is made possible. With knowledge of the relative area of the Faraday cups, the ion flux and areal dose can also be obtained.

  6. Fine-structure characteristics in the emittance images of a strongly focusing He{sup +} beam

    SciTech Connect (OSTI)

    Sasao, M.; Kobuchi, T.; Kisaki, M.; Takahashi, H.; Okamoto, A.; Kitajima, S.; Kaneko, O.; Tsumori, K.; Shinto, K.; Wada, M.

    2010-02-15

    The phase space distribution of a strongly focused He{sup +} ion beam source equipped with concave multiaperture electrodes was measured using a pepper-pot plate and a Kapton foil. The substructure of 301 merging He beamlets was clearly observed on a footprint of pepper-pot hole at the beam waist, where the beam density was 500 mA/cm{sup 2}. The position and the width of each beamlet substructure show the effect of interference of beamlets with surrounding one.

  7. Aerosol beam-focus laser-induced plasma spectrometer device

    DOE Patents [OSTI]

    Cheng, Meng-Dawn

    2002-01-01

    An apparatus for detecting elements in an aerosol includes an aerosol beam focuser for concentrating aerosol into an aerosol beam; a laser for directing a laser beam into the aerosol beam to form a plasma; a detection device that detects a wavelength of a light emission caused by the formation of the plasma. The detection device can be a spectrometer having at least one grating and a gated intensified charge-coupled device. The apparatus may also include a processor that correlates the wavelength of the light emission caused by the formation of the plasma with an identity of an element that corresponds to the wavelength. Furthermore, the apparatus can also include an aerosol generator for forming an aerosol beam from bulk materials. A method for detecting elements in an aerosol is also disclosed.

  8. Electrostatic quadrupole array for focusing parallel beams of charged particles

    DOE Patents [OSTI]

    Brodowski, John

    1982-11-23

    An array of electrostatic quadrupoles, capable of providing strong electrostatic focusing simultaneously on multiple beams, is easily fabricated from a single array element comprising a support rod and multiple electrodes spaced at intervals along the rod. The rods are secured to four terminals which are isolated by only four insulators. This structure requires bias voltage to be supplied to only two terminals and eliminates the need for individual electrode bias and insulators, as well as increases life by eliminating beam plating of insulators.

  9. Simulation Studies of Beam-Beam Effects of a Ring-Ring Electron-Ion Collider Based on CEBAF

    SciTech Connect (OSTI)

    Yuhong Zhang,Ji Qiang

    2009-05-01

    The collective beam-beam effect can potentially cause a rapid growth of beam sizes and reduce the luminosity of a collider to an unacceptably low level. The ELIC, a proposed ultra high luminosity electron-ion collider based on CEBAF, employs high repetition rate crab crossing colliding beams with very small bunch transverse sizes and very short bunch lengths, and collides them at up to 4 interaction points with strong final focusing. All of these features can make the beam-beam effect challenging. In this paper, we present simulation studies of the beam-beam effect in ELIC using a self-consistent strong-strong beam-beam simulation code developed at Lawrence Berkeley National Laboratory. This simulation study is used for validating the ELIC design and for searching for an optimal parameter set.

  10. Expanded studies of linear collider final focus systems at the Final Focus Test Beam

    SciTech Connect (OSTI)

    Tenenbaum, P.G.

    1995-12-01

    In order to meet their luminosity goals, linear colliders operating in the center-of-mass energy range from 3,50 to 1,500 GeV will need to deliver beams which are as small as a few Manometers tall, with x:y aspect ratios as large as 100. The Final Focus Test Beam (FFTB) is a prototype for the final focus demanded by these colliders: its purpose is to provide demagnification equivalent to those in the future linear collider, which corresponds to a focused spot size in the FFTB of 1.7 microns (horizontal) by 60 manometers (vertical). In order to achieve the desired spot sizes, the FFTB beam optics must be tuned to eliminate aberrations and other errors, and to ensure that the optics conform to the desired final conditions and the measured initial conditions of the beam. Using a combination of incoming-beam diagnostics. beam-based local diagnostics, and global tuning algorithms, the FFTB beam size has been reduced to a stable final size of 1.7 microns by 70 manometers. In addition, the chromatic properties of the FFTB have been studied using two techniques and found to be acceptable. Descriptions of the hardware and techniques used in these studies are presented, along with results and suggestions for future research.

  11. Non-traditional ion beam analyses

    SciTech Connect (OSTI)

    Doyle, B.L.; Knapp, J.A.; Banks, J.C.; Barbour, J.C.; Walsh, D.S.

    1993-02-01

    Rutherford backscattering spectrometry (RBS), elastic recoil detection (ERD), proton induced x-ray emission (PIXE) and nuclear reaction analysis (NRA) are among the most commonly used, or traditional, ion beam analysis (IBA) techniques. In this review, several adaptations of these IBA techniques are described where either the approach used in the analysis or the application area is clearly non-traditional or unusual. These analyses and/or applications are summarized in this paper.

  12. Production of intense beams of singly charged radioactive ions

    SciTech Connect (OSTI)

    Kuznetsov, G.; Batazova, M.; Gubin, K.; Logachev, P.; Martyshkin, P.

    2006-03-15

    An apparatus for the production of intense beams of singly charged radioactive ions operating in on-line regime is proposed. The radioactive atoms are produced in a uranium-graphite (UC) target bombarded with neutrons. The neutron flux is generated by a graphite neutron converter, which is bombarded with protons. The atoms of the produced isotopes are ionized in the electron beam generated with the electron gun and the ions of interest are extracted in a separator. The apparatus consists of the following parts. (1) Rotating converter dissipating a substantial power of proton beam. (2) UC target placed in a graphite container at high temperature. The atoms of radioactive isotopes can be extracted with a flow of noble gas. (3) Triode electron gun with ionization channel is placed inside the solenoid forming a focusing magnetic field. The cathode of the electron gun is a spout of the graphite container. The atoms of radioactive isotopes are carried with gas flow through the spout into the electron beam. (4) Correction coil located near the gun matches the electron beam with the ionization channel. (5) The first anode has a potential of 1-4 kV with respect to the cathode, and the second anode has some lower potential than the first anode and it is the tube of ionization channel. (6) Electron collector dissipates the electron-beam power. (7) Uranium-graphite target, the gun, the ionization channel as well as solenoid are located on an isolated platform with potential of 30-60 kV with respect to ground. The beam of singly charged ions from the ionization channel passes the collector, goes through the extractor, acquires energy of 30-60 keV, and gets transported to the separator where the required species are selected.

  13. Electrostatic quadrupole focused particle accelerating assembly with laminar flow beam

    DOE Patents [OSTI]

    Maschke, A.W.

    1984-04-16

    A charged particle accelerating assembly provided with a predetermined ratio of parametric structural characteristics and with related operating voltages applied to each of its linearly spaced focusing and accelerating quadrupoles, thereby to maintain a particle beam traversing the electrostatic fields of the quadrupoles in the assembly in an essentially laminar flow through the assembly.

  14. Electrostatic quadrupole focused particle accelerating assembly with laminar flow beam

    DOE Patents [OSTI]

    Maschke, Alfred W.

    1985-01-01

    A charged particle accelerating assembly provided with a predetermined ratio of parametric structural characteristics and with related operating voltages applied to each of its linearly spaced focusing and accelerating quadrupoles, thereby to maintain a particle beam traversing the electrostatic fields of the quadrupoles in the assembly in an essentially laminar flow throughout the assembly.

  15. High-energy accelerator for beams of heavy ions

    DOE Patents [OSTI]

    Martin, Ronald L.; Arnold, Richard C.

    1978-01-01

    An apparatus for accelerating heavy ions to high energies and directing the accelerated ions at a target comprises a source of singly ionized heavy ions of an element or compound of greater than 100 atomic mass units, means for accelerating the heavy ions, a storage ring for accumulating the accelerated heavy ions and switching means for switching the heavy ions from the storage ring to strike a target substantially simultaneously from a plurality of directions. In a particular embodiment the heavy ion that is accelerated is singly ionized hydrogen iodide. After acceleration, if the beam is of molecular ions, the ions are dissociated to leave an accelerated singly ionized atomic ion in a beam. Extraction of the beam may be accomplished by stripping all the electrons from the atomic ion to switch the beam from the storage ring by bending it in magnetic field of the storage ring.

  16. University of Wisconsin Ion Beam Laboratory: A facility for irradiated materials and ion beam analysis

    SciTech Connect (OSTI)

    Field, K. G.; Wetteland, C. J.; Cao, G.; Maier, B. R.; Gerczak, T. J.; Kriewaldt, K.; Sridharan, K.; Allen, T. R.; Dickerson, C.; Field, C. R.

    2013-04-19

    The University of Wisconsin Ion Beam Laboratory (UW-IBL) has recently undergone significant infrastructure upgrades to facilitate graduate level research in irradiated materials phenomena and ion beam analysis. A National Electrostatics Corp. (NEC) Torodial Volume Ion Source (TORVIS), the keystone upgrade for the facility, can produce currents of hydrogen ions and helium ions up to {approx}200 {mu}A and {approx}5 {mu}A, respectively. Recent upgrades also include RBS analysis packages, end station developments for irradiation of relevant material systems, and the development of an in-house touch screen based graphical user interface for ion beam monitoring. Key research facilitated by these upgrades includes irradiation of nuclear fuels, studies of interfacial phenomena under irradiation, and clustering dynamics of irradiated oxide dispersion strengthened steels. The UW-IBL has also partnered with the Advanced Test Reactor National Scientific User Facility (ATR-NSUF) to provide access to the irradiation facilities housed at the UW-IBL as well as access to post irradiation facilities housed at the UW Characterization Laboratory for Irradiated Materials (CLIM) and other ATR-NSUF partner facilities. Partnering allows for rapid turnaround from proposed research to finalized results through the ATR-NSUF rapid turnaround proposal system. An overview of the UW-IBL including CLIM and relevant research is summarized.

  17. Temporal and spatial study of neon ion emission from a plasma focus device

    SciTech Connect (OSTI)

    Bhuyan, M.; Neog, N. K.; Mohanty, S. R. [Centre of Plasma Physics, Institute for Plasma Research, Sonapur, Kamrup 782402 (India); Rao, C. V. S. [Institute for Plasma Research, Bhat, Gandhinagar 382428 (India); Raole, P. M. [FCIPT, Institute for Plasma Research, Gandhinagar 342044 (India)

    2011-03-15

    The temporal and spatial characteristics of the neon ion beam emissions from a low energy plasma focus device have been studied by employing a multiple Faraday cup assembly and the CR-39 track detectors at different angular and axial positions. In addition, the operating gas pressures were also varied to study the temporal and spatial characteristics of the neon ion beam emissions. The Faraday cup analyses show that the ion flux strongly depends on the operating gas pressure as well as the angular positions. The estimated ion energy measurements at the aperture of the Faraday cup indicate that the plasma focus device is a source of polyenergetic ions ranging from approximately a few keV to a few hundreds of keV, irrespective of the angular positions. The exposed CR-39 detectors have shown the formation of multiple ion tracks with diameter ranging from 2 to 13 {mu}m. The populations of lower diameter tracks (2-6 {mu}m) are observed to be more at 0 deg. and 10 deg. angles. It is also noticed that the most populated track counts have shifted toward the higher diameter as the angular positions change from 0 deg. to 70 deg. The present study enables us to predict a clear picture of ion flux and energy distribution inside the plasma focus chamber that will help to use the device for material irradiation application in a more controlled manner.

  18. Positive and negative ion beam merging system for neutral beam production

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Reijonen, Jani

    2005-12-13

    The positive and negative ion beam merging system extracts positive and negative ions of the same species and of the same energy from two separate ion sources. The positive and negative ions from both sources pass through a bending magnetic field region between the pole faces of an electromagnet. Since the positive and negative ions come from mirror image positions on opposite sides of a beam axis, and the positive and negative ions are identical, the trajectories will be symmetrical and the positive and negative ion beams will merge into a single neutral beam as they leave the pole face of the electromagnet. The ion sources are preferably multicusp plasma ion sources. The ion sources may include a multi-aperture extraction system for increasing ion current from the sources.

  19. Ion-beam apparatus and method for analyzing and controlling integrated circuits

    DOE Patents [OSTI]

    Campbell, A.N.; Soden, J.M.

    1998-12-01

    An ion-beam apparatus and method for analyzing and controlling integrated circuits are disclosed. The ion-beam apparatus comprises a stage for holding one or more integrated circuits (ICs); a source means for producing a focused ion beam; and a beam-directing means for directing the focused ion beam to irradiate a predetermined portion of the IC for sufficient time to provide an ion-beam-generated electrical input signal to a predetermined element of the IC. The apparatus and method have applications to failure analysis and developmental analysis of ICs and permit an alteration, control, or programming of logic states or device parameters within the IC either separate from or in combination with applied electrical stimulus to the IC for analysis thereof. Preferred embodiments of the present invention including a secondary particle detector and an electron floodgun further permit imaging of the IC by secondary ions or electrons, and allow at least a partial removal or erasure of the ion-beam-generated electrical input signal. 4 figs.

  20. Ion-beam apparatus and method for analyzing and controlling integrated circuits

    DOE Patents [OSTI]

    Campbell, Ann N.; Soden, Jerry M.

    1998-01-01

    An ion-beam apparatus and method for analyzing and controlling integrated circuits. The ion-beam apparatus comprises a stage for holding one or more integrated circuits (ICs); a source means for producing a focused ion beam; and a beam-directing means for directing the focused ion beam to irradiate a predetermined portion of the IC for sufficient time to provide an ion-beam-generated electrical input signal to a predetermined element of the IC. The apparatus and method have applications to failure analysis and developmental analysis of ICs and permit an alteration, control, or programming of logic states or device parameters within the IC either separate from or in combination with applied electrical stimulus to the IC for analysis thereof. Preferred embodiments of the present invention including a secondary particle detector and an electron floodgun further permit imaging of the IC by secondary ions or electrons, and allow at least a partial removal or erasure of the ion-beam-generated electrical input signal.

  1. Methods and apparatus for altering material using ion beams

    DOE Patents [OSTI]

    Bloomquist, Douglas D.; Buchheit, Rudy; Greenly, John B.; McIntyre, Dale C.; Neau, Eugene L.; Stinnett, Regan W.

    1996-01-01

    A method and apparatus for treating material surfaces using a repetitively pulsed ion beam. In particular, a method of treating magnetic material surfaces in order to reduce surface defects, and produce amorphous fine grained magnetic material with properties that can be tailored by adjusting treatment parameters of a pulsed ion beam. In addition to a method of surface treating materials for wear and corrosion resistance using pulsed particle ion beams.

  2. Method of automatic measurement and focus of an electron beam and apparatus therefor

    DOE Patents [OSTI]

    Giedt, Warren H.; Campiotti, Richard

    1996-01-01

    An electron beam focusing system, including a plural slit-type Faraday beam trap, for measuring the diameter of an electron beam and automatically focusing the beam for welding. Beam size is determined from profiles of the current measured as the beam is swept over at least two narrow slits of the beam trap. An automated procedure changes the focus coil current until the focal point location is just below a workpiece surface. A parabolic equation is fitted to the calculated beam sizes from which optimal focus coil current and optimal beam diameter are determined.

  3. Method of automatic measurement and focus of an electron beam and apparatus therefore

    DOE Patents [OSTI]

    Giedt, W.H.; Campiotti, R.

    1996-01-09

    An electron beam focusing system, including a plural slit-type Faraday beam trap, for measuring the diameter of an electron beam and automatically focusing the beam for welding is disclosed. Beam size is determined from profiles of the current measured as the beam is swept over at least two narrow slits of the beam trap. An automated procedure changes the focus coil current until the focal point location is just below a workpiece surface. A parabolic equation is fitted to the calculated beam sizes from which optimal focus coil current and optimal beam diameter are determined. 12 figs.

  4. Inhomogeneity smoothing using density valley formed by ion beam...

    Office of Scientific and Technical Information (OSTI)

    in an ion-beam inertial confinement fusion pellets by numerical simulation. The simulation results show that the radiation energy is confined in the density valley, and the ...

  5. Effect of the electrostatic plasma lens on the emittance of ahigh-current heavy ion beam

    SciTech Connect (OSTI)

    Chekh, Yu.; Goncharov, A.; Protsenko, I.; Brown, I.G.

    2004-01-10

    We describe measurements we have made of the emittance of a high-current, moderate-energy ion beam after transport through a permanent-magnet electrostatic plasma lens. The results indicate the absence of emittance growth due to the lens, when the lens is adjusted for optimal beam focusing. The measured emittance for a 16 keV Cu{sup 2+} ion beam formed by a vacuum arc ion source was about 0.4 {pi} {center_dot} mm {center_dot} mrad at a beam current of 50 mA rising more-or-less linearly to 1.5 {pi} {center_dot} mm {center_dot} mrad at 250 mA, and was conserved in beam transport through the lens. These results have significance for the application of high-current ion sources and the electrostatic plasma lens to particle accelerator injection.

  6. Beam charge and current neutralization of high-charge-state heavy ions

    SciTech Connect (OSTI)

    Logan, B.G.; Callahan, D.A.

    1997-10-29

    High-charge-state heavy-ions may reduce the accelerator voltage and cost of heavy-ion inertial fusion drivers, if ways can be found to neutralize the space charge of the highly charged beam ions as they are focused to a target in a fusion chamber. Using 2-D Particle-In- Cell simulations, we have evaluated the effectiveness of two different methods of beam neutralization: (1) by redistribution of beam charge in a larger diameter, preformed plasma in the chamber, and (2), by introducing a cold-electron-emitting source within the beam channel at the beam entrance into the chamber. We find the latter method to be much more effective for high-charge-state ions.

  7. A new luminescence beam profile monitor for intense proton and heavy ion beams

    SciTech Connect (OSTI)

    Tsang,T.; Bellavia, S.; Connolly, R.; Gassner, D.; Makdisi, Y.; Russo, T.; Thieberger, P.; Trbojevic, D.; Zelenski, A.

    2008-10-01

    A new luminescence beam profile monitor is realized in the polarized hydrogen gas jet target at the Relativistic Heavy Ion Collider (RHIC) facility. In addition to the spin polarization of the proton beam being routinely measured by the hydrogen gas jet, the luminescence produced by beam-hydrogen excitation leads to a strong Balmer series lines emission. A selected hydrogen Balmer line is spectrally filtered and imaged to produce the transverse RHIC proton beam shape with unprecedented details on the RHIC beam profile. Alternatively, when the passage of the high energy RHIC gold ion beam excited only the residual gas molecules in the beam path, sufficient ion beam induced luminescence is produced and the transverse gold ion beam profile is obtained. The measured transverse beam sizes and the calculated emittances provide an independent confirmation of the RHIC beam characteristics and to verify the emittance conservation along the RHIC accelerator. This optical beam diagnostic technique by making use of the beam induced fluorescence from injected or residual gas offers a truly noninvasive particle beam characterization, and provides a visual observation of proton and heavy ion beams. Combined with a longitudinal bunch measurement system, a 3-dimensional spatial particle beam profile can be reconstructed tomographically.

  8. Fluctuation of an ion beam extracted from an AC filament driven Bernas-type ion source

    SciTech Connect (OSTI)

    Miyamoto, N. Okajima, Y.; Wada, M.

    2014-02-15

    Argon ion beam fluctuation from an AC filament driven Bernas-type ion source is observed. The ion beam was measured by an 8 measurement elements beam profile monitor. The amplitude of the beam current fluctuation stayed in the same level from 100 Hz to 1 kHz of the filament heating frequency. The beam current fluctuation frequency measured by the beam profile monitor was equal to the frequency of the AC filament operation. The fluctuation amplitudes of the beam current by AC operation were less than 7% and were in the same level of the DC operation.

  9. Beam halo formation from space-charge dominated beams in uniform focusing channels

    SciTech Connect (OSTI)

    O'Connell, J.S. ); Wangler, T.P.; Mills, R.S. ); Crandall, K.R. )

    1993-01-01

    In space-charge dominated beams the nonlinear space-charge forces produce a filamentation pattern, which results in a 2-component beam consisting of an inner core and an outer halo. The halo is very prominent in mismatched beams, and the potential for accelerator activation is of concern for a next generation of cw, high-power proton linacs that could be applied for intense neutron generators to process nuclear materials. We present new results about beam halo and the evolution of space-charge dominated beams from multiparticle simulation of initial laminar beams in a uniform linear focusing channel, and from a model consisting of single particle interactions with a uniform-density beam core. We study the energy gain from particle interactions with the space-charge field of the core, and we identify the resonant characteristic of this interaction as the basic cause of the separation of the beam into the two components. We identify three different particle-trajectory types, and we suggest that one of these types may lead to continuous halo growth, even after the halo is removed by collimators.

  10. Beam halo formation from space-charge dominated beams in uniform focusing channels

    SciTech Connect (OSTI)

    O`Connell, J.S.; Wangler, T.P.; Mills, R.S.; Crandall, K.R.

    1993-06-01

    In space-charge dominated beams the nonlinear space-charge forces produce a filamentation pattern, which results in a 2-component beam consisting of an inner core and an outer halo. The halo is very prominent in mismatched beams, and the potential for accelerator activation is of concern for a next generation of cw, high-power proton linacs that could be applied for intense neutron generators to process nuclear materials. We present new results about beam halo and the evolution of space-charge dominated beams from multiparticle simulation of initial laminar beams in a uniform linear focusing channel, and from a model consisting of single particle interactions with a uniform-density beam core. We study the energy gain from particle interactions with the space-charge field of the core, and we identify the resonant characteristic of this interaction as the basic cause of the separation of the beam into the two components. We identify three different particle-trajectory types, and we suggest that one of these types may lead to continuous halo growth, even after the halo is removed by collimators.

  11. The beam optics of the Argonne Positive-Ion Injector

    SciTech Connect (OSTI)

    Pardo, R.C.; Shepard, K.W.; Karls, M.

    1987-01-01

    The beam optics for Phase I of the Argonne Positive-Ion Injector linac system have been studied for a representative set of beams. The results of this study indicate that high charge state beams from an ECR source can be accelerated without significantly increasing the transverse or longitudinal emittance of the initial beam. It is expected that the beam quality from the PII-ATLAS system will be at least as good as presently achieved with the tandem-ATLAS system.

  12. Optics of ion beams for the neutral beam injection system on HL-2A Tokamak

    SciTech Connect (OSTI)

    Zou, G. Q.; Lei, G. J.; Cao, J. Y.; Duan, X. R.

    2012-07-15

    The ion beam optics for the neutral beam injection system on HL-2A Tokomak is studied by two- dimensional numerical simulation program firstly, where the emitting surface is taken at 100 Debye lengths from the plasma electrode. The mathematical formulation, computation techniques are described. Typical ion orbits, equipotential contours, and emittance diagram are shown. For a fixed geometry electrode, the effect of plasma density, plasma potential and plasma electron temperature on ion beam optics is examined, and the calculation reliability is confirmed by experimental results. In order to improve ion beam optics, the application of a small pre-acceleration voltage ({approx}100 V) between the plasma electrode and the arc discharge anode is reasonable, and a lower plasma electron temperature is desired. The results allow optimization of the ion beam optics in the neutral beam injection system on HL-2A Tokomak and provide guidelines for designing future neutral beam injection system on HL-2M Tokomak.

  13. Experimental measurement of the 4-d transverse phase space map of a heavy ion beam

    SciTech Connect (OSTI)

    Hopkins, H S

    1997-12-01

    The development and employment of a new diagnostic instrument for characterizing intense, heavy ion beams is reported on. This instrument, the ''Gated Beam Imager'' or ''GBI'' was designed for use on Lawrence Livermore National Laboratory Heavy Ion Fusion Project's ''Small Recirculator'', an integrated, scaled physics experiment and engineering development project for studying the transport and control of intense heavy ion beams as inertial fusion drivers in the production of electric power. The GBI allows rapid measurement and calculation of a heavy ion beam's characteristics to include all the first and second moments of the transverse phase space distribution, transverse emittance, envelope parameters and beam centroid. The GBI, with appropriate gating produces a time history of the beam resulting in a 4-D phase-space and time ''map'' of the beam. A unique capability of the GBI over existing diagnostic instruments is its ability to measure the ''cross'' moments between the two transverse orthogonal directions. Non-zero ''cross'' moments in the alternating gradient lattice of the Small Recirculator are indicative of focusing element rotational misalignments contributing to beam emittance growth. This emittance growth, while having the same effect on the ability to focus a beam as emittance growth caused by non-linear effects, is in principle removable by an appropriate number of focusing elements. The instrument uses the pepperpot method of introducing a plate with many pinholes into the beam and observing the images of the resulting beamlets as they interact with a detector after an appropriate drift distance. In order to produce adequate optical signal and repeatability, the detector was chosen to be a microchannel plate (MCP) with a phosphor readout screen. The heavy ions in the pepperpot beamlets are stopped in the MCP's thin front metal anode and the resulting secondary electron signal is amplified and proximity-focused onto the phosphor while maintaining

  14. Target fabrication for ion-beam driven hohlraum experiments

    SciTech Connect (OSTI)

    Aubert, J.H.; Sawyer, P.S.; Smith, M.L.

    1997-05-01

    Ion-beam driven hohlraum targets were designed to absorb the energy of PBFAII lithium ion beams within a foam, which converted the ion beam energy into x-rays. The foam was held within a gold hohlraum. X-ray radiation was observed from the top of the target through a circular diagnostic aperture. On the bottom of the target was a gold-coated aluminum witness plate, which was a component of an active, shock-breakout diagnostic. Surrounding the outside of the hohlraum were five titanium pins which produced ion-induced inner-shell x-rays (4.5 keV) to diagnose the lithium beam. Several different manufacturing processes and characterization techniques were utilized to prepare these targets. Extensive documentation provided quality control on their preparation. This report summarizes the preparation, characterization, and documentation of targets for ion-beam driven hohlraum experiments.

  15. Direct plasma injection scheme with various ion beams

    SciTech Connect (OSTI)

    Okamura, M.

    2010-09-15

    The laser ion source is one of the most powerful heavy ion sources. However, it is difficult to obtain good stability and to control its intense current. To overcome these difficulties, we proposed a new beam injection scheme called 'direct plasma injection scheme'. Following this it was established to provide various species with desired charge state as an intense accelerated beam. Carbon, aluminum and iron beams have been tested.

  16. Status of the SNS H- ion source and low-energy beam transport system

    SciTech Connect (OSTI)

    Keller, R.; Thomae, R.; Stockli, M.; Welton, R.

    2002-04-01

    The ion source and Low-Energy Transport (LEBT) system that will provide H{sup -} ion beams to the Spallation Neutron Source (SNS) Front End and the accelerator chain have been developed into a mature unit that will satisfy the operational needs through the commissioning and early operating phases of SNS. The ion source was derived from the SSC ion source, and many of its original features have been improved to achieve reliable operation at 6% duty factor, producing beam currents in the 35-mA range and above. The LEBT utilizes purely electrostatic focusing and includes static beam-steering elements and a pre-chopper. This paper will discuss the latest design features of the ion source and LEBT, give performance data for the integrated system, and report on relevant commissioning results obtained with the SNS RFQ accelerator. Perspectives for further improvements will be outlined in concluding remarks.

  17. Heavy-ion Fusion Reactions with Neutron-rich Radioactive Ion Beams

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Heavy-ion Fusion Reactions with Neutron-rich Radioactive Ion Beams A. Wakhle National Superconducting Cyclotron Laboratory, Michigan State University, East Lansing, Michigan 48824, USA The predicted shell closures forming the 'island of stability' [1-2] are beyond the reach of stable beams [3]. This dictates that future efforts towards the synthesis of super-heavy elements (SHEs) [4] must utilize neutron-rich radioactive ion beams (RIBs). The low intensities of RIBs puts this goal beyond the

  18. Transverse Centroid Oscillations in Solenoidially Focused Beam Transport Lattices

    SciTech Connect (OSTI)

    Lund, S M; Wootton, C J; Lee, E P

    2008-08-01

    Linear equations of motion are derived that describe small-amplitude centroid oscillations induced by displacement and rotational misalignments of the focusing solenoids in the transport lattice, dipole steering elements, and initial centroid offset errors. These equations are analyzed in a local rotating Larmor frame to derive complex-variable 'alignment functions' and 'bending functions' that efficiently describe the characteristics of the centroid oscillations induced by mechanical misalignments of the solenoids and dipole steering elements. The alignment and bending functions depend only on properties of the ideal lattice in the absence of errors and steering and have associated expansion amplitudes set by the misalignments and steering fields. Applications of this formulation are presented for statistical analysis of centroid deviations, calculation of actual lattice misalignments from centroid measurements, and optimal beam steering.

  19. Transverse centroid oscillations in solenoidially focused beam transport lattices

    SciTech Connect (OSTI)

    Lund, Steven M.; Wootton, Christopher J.; Lee, Edward P.

    2008-08-01

    Linear equations of motion are derived that describe small-amplitude centroid oscillations induced by displacement and rotational misalignments of the focusing solenoids in the transport lattice, dipole steering elements, and initial centroid offset errors. These equations are analyzed in a local rotating Larmor frame to derive complex-variable"alignment functions" and"bending functions" that efficiently describe the characteristics of the centroid oscillations induced by mechanical misalignments of the solenoids and dipole steering elements. The alignment and bending functions depend only on properties of the ideal lattice in the absence of errors and steering and have associated expansion amplitudes set by the misalignments and steering fields. Applications of this formulation are presented for statistical analysis of centroid deviations, calculation of actual lattice misalignments from centroid measurements, and optimal beam steering.

  20. Fundamental edge broadening effects during focused electron beam induced nanosynthesis

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Schmied, Roland; Fowlkes, Jason Davidson; Winkler, Robert; Rack, Phillip D.; Plank, Harald

    2015-02-16

    In this study, we explore lateral broadening effects of 3D structures fabricated through focused electron beam induced deposition using MeCpPt(IV)Me3 precursor. In particular, the scaling behavior of proximity effects as a function of the primary electron energy and the deposit height is investigated through experiments and validated through simulations. Correlated Kelvin force microscopy and conductive atomic force microscopy measurements identified conductive and non-conductive proximity regions. It was determined that the highest primary electron energies enable the highest edge sharpness while lower energies contain a complex convolution of broadening effects. In addition, it is demonstrated that intermediate energies lead to evenmore » more complex proximity effects that significantly reduce lateral edge sharpness and thus should be avoided if desiring high lateral resolution.« less

  1. Method and apparatus for efficient photodetachment and purification of negative ion beams

    DOE Patents [OSTI]

    Beene, James R.; Liu, Yuan; Havener, Charles C.

    2008-02-26

    Methods and apparatus are described for efficient photodetachment and purification of negative ion beams. A method of purifying an ion beam includes: inputting the ion beam into a gas-filled multipole ion guide, the ion beam including a plurality of ions; increasing a laser-ion interaction time by collisional cooling the plurality of ions using the gas-filled multipole ion guide, the plurality of ions including at least one contaminant; and suppressing the at least one contaminant by selectively removing the at least one contaminant from the ion beam by electron photodetaching at least a portion of the at least one contaminant using a laser beam.

  2. Measurements - Ion Beams - Radiation Effects Facility / Cyclotron Institute

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    / Texas A&M University Ion Beams Available Beams / Beam Change Times / Measurements / Useful Graphs Measurements The beam uniformity and flux are determined using an array of five detectors. Each detector is made up with a plastic scintillator coupled to photo-multiplier tubes. Four of the detectors are fixed in position and set up to measure beam particle counting rates continuously at four characteristic points 1.64 inches (4.71 mm) away from the beam axis. The fifth scintillator can

  3. Ion beam collimating grid to reduce added defects

    DOE Patents [OSTI]

    Lindquist, Walter B. (Oakland, CA); Kearney, Patrick A. (Livermore, CA)

    2003-01-01

    A collimating grid for an ion source located after the exit grid. The collimating grid collimates the ion beamlets and disallows beam spread and limits the beam divergence during transients and steady state operation. The additional exit or collimating grid prevents beam divergence during turn-on and turn-off and prevents ions from hitting the periphery of the target where there is re-deposited material or from missing the target and hitting the wall of the vessel where there is deposited material, thereby preventing defects from being deposited on a substrate to be coated. Thus, the addition of a collimating grid to an ion source ensures that the ion beam will hit and be confined to a specific target area.

  4. DIAGNOSTICS FOR ION BEAM DRIVEN HIGH ENERGY DENSITY PHYSICS EXPERIMENTS

    SciTech Connect (OSTI)

    Bieniosek, F.M.; Henestroza, E.; Lidia, S.; Ni, P.A.

    2010-01-04

    Intense beams of heavy ions are capable of heating volumetric samples of matter to high energy density. Experiments are performed on the resulting warm dense matter (WDM) at the NDCX-I ion beam accelerator. The 0.3 MeV, 30-mA K{sup +} beam from NDCX-I heats foil targets by combined longitudinal and transverse neutralized drift compression of the ion beam. Both the compressed and uncompressed parts of the NDCX-I beam heat targets. The exotic state of matter (WDM) in these experiments requires specialized diagnostic techniques. We have developed a target chamber and fielded target diagnostics including a fast multi-channel optical pyrometer, optical streak camera, laser Doppler-shift interferometer (VISAR), beam transmission diagnostics, and high-speed gated cameras. We also present plans and opportunities for diagnostic development and a new target chamber for NDCX-II.

  5. Preliminary result of rapid solenoid for controlling heavy-ion beam parameters of laser ion source

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Okamura, M.; Sekine, M.; Ikeda, S.; Kanesue, T.; Kumaki, M.; Fuwa, Y.

    2015-03-13

    To realize a heavy ion inertial fusion driver, we have studied a possibility of laser ion source (LIS). A LIS can provide high current high brightness heavy ion beams, however it was difficult to manipulate the beam parameters. To overcome the issue, we employed a pulsed solenoid in the plasma drift section and investigated the effect of the solenoid field on singly charged iron beams. The rapid ramping magnetic field could enhance limited time slice of the current and simultaneously the beam emittance changed accordingly. This approach may also useful to realize an ion source for HIF power plant.

  6. Sandia National Laboratories: Ion Beam Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    high energy ion microscopes to determine the radiation hardness and softness of microelectronics; identifying potential weaknesses. In situ Ion Irradiation Microscopy (I3M) Real...

  7. First Beam Waist Measurements in the Final Focus Beam Line at the KEK Accelerator Test Facility

    SciTech Connect (OSTI)

    Bai, Sha; Aryshev, Alexander; Bambade, Philip; McCormick, Doug; Bolzon, Benoit; Gao, Jie; Tauchi, Toshiaki; Zhou, Feng; /SLAC

    2012-06-22

    The ATF2 project is the final focus system prototype for the ILC and CLIC linear collider projects, with a purpose to reach a 37 nm vertical beam size at the interaction point using compact optics based on a novel scheme of local chromaticity correction. Construction of all components and installation were completed at the end of 2008. An initial commissioning phase followed in 2009, using larger than nominal {beta} functions at the interaction point, corresponding to reduced demagnification factors in comparison to the design, to limit effects from higher-order optical aberrations and hence simplify beam tuning procedures while key instrumentation was being tested and calibrated. In this paper, first measurements of dispersion and Twiss parameters are presented based on scanning the beam during this period with a set of tungsten wires located just behind the interaction point, using two complementary analysis methods.

  8. Draft Project Execution Plan for the Ion Beam Laboratory at Sandia...

    Office of Environmental Management (EM)

    Draft Project Execution Plan for the Ion Beam Laboratory at Sandia National Laboratories Draft Project Execution Plan for the Ion Beam Laboratory at Sandia National Laboratories ...

  9. Polarization Studies in Fast-Ion Beam Spectroscopy

    SciTech Connect (OSTI)

    Trabert, E

    2001-12-20

    In a historical review, the observations and the insight gained from polarization studies of fast ions interacting with solid targets are presented. These began with J. Macek's recognition of zero-field quantum beats in beam-foil spectroscopy as indicating alignment, and D.G. Ellis' density operator analysis that suggested the observability of orientation when using tilted foils. Lastly H. Winter's studies of the ion-beam surface interaction at grazing incidence yielded the means to produce a high degree of nuclear orientation in ion beams.

  10. Method for reduction of selected ion intensities in confined ion beams

    DOE Patents [OSTI]

    Eiden, G.C.; Barinaga, C.J.; Koppenaal, D.W.

    1998-06-16

    A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer. 7 figs.

  11. Apparatus for reduction of selected ion intensities in confined ion beams

    DOE Patents [OSTI]

    Eiden, Gregory C. (Richland, WA); Barinaga, Charles J. (Richland, WA); Koppenaal, David W. (Richland, WA)

    2001-01-01

    An apparatus for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the apparatus has an ion trap or a collision cell containing a reagent gas wherein the reagent gas accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the collision cell as employed in various locations within analytical instruments including an inductively coupled plasma mass spectrometer.

  12. Method for reduction of selected ion intensities in confined ion beams

    DOE Patents [OSTI]

    Eiden, Gregory C. (Richland, WA); Barinaga, Charles J. (Richland, WA); Koppenaal, David W. (Richland, WA)

    1998-01-01

    A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.

  13. Ion source and beam guiding studies for an API neutron generator

    SciTech Connect (OSTI)

    Sy, A.; Ji, Q.; Persaud, A.; Ludewigt, B. A.; Schenkel, T.

    2013-04-19

    Recently developed neutron imaging methods require high neutron yields for fast imaging times and small beam widths for good imaging resolution. For ion sources with low current density to be viable for these types of imaging methods, large extraction apertures and beam focusing must be used. We present recent work on the optimization of a Penning-type ion source for neutron generator applications. Two multi-cusp magnet configurations have been tested and are shown to increase the extracted ion current density over operation without multi-cusp magnetic fields. The use of multi-cusp magnetic confinement and gold electrode surfaces have resulted in increased ion current density, up to 2.2 mA/cm{sup 2}. Passive beam focusing using tapered dielectric capillaries has been explored due to its potential for beam compression without the cost and complexity issues associated with active focusing elements. Initial results from first experiments indicate the possibility of beam compression. Further work is required to evaluate the viability of such focusing methods for associated particle imaging (API) systems.

  14. Transverse coupling property of beam from ECR ion sources

    SciTech Connect (OSTI)

    Yang, Y.; Yuan, Y. J.; Sun, L. T.; Feng, Y. C.; Fang, X.; Cao, Y.; Lu, W.; Zhang, X. Z.; Zhao, H. W.

    2014-11-15

    Experimental evidence of the property of transverse coupling of beam from Electron Cyclotron Resonance (ECR) ion source is presented. It is especially of interest for an ECR ion source, where the cross section of extracted beam is not round along transport path due to the magnetic confinement configuration. When the ions are extracted and accelerated through the descending axial magnetic field at the extraction region, the horizontal and vertical phase space strongly coupled. In this study, the coupling configuration between the transverse phase spaces of the beam from ECR ion source is achieved by beam back-tracking simulation based on the measurements. The reasonability of this coupling configuration has been proven by a series of subsequent simulations.

  15. Profile of single-pulsed ion beams in acceleration gap

    SciTech Connect (OSTI)

    Xiang, W.; Tang, P.Y.

    2006-03-15

    In an attempt to understand the characteristics of single-pulsed ion beams extracted from a miniature occluded-gas sources with electrodes of metallic hydride, a two-dimensional (2D) projected image of ion beams extracted from the single-pulsed occluded-gas source was captured using a digital charge-coupled device camera on a test bench. Based on image processing and the inverse Abel transform, the 2D integrally projected image with cylindrical symmetry was used to determine the profile of ion beams in the acceleration gap. The result shows that the radial beam profile in acceleration gap has a Gaussian-like shape, and the maximum beam intensity behind the plasma electrode is about 40% higher than that in front of the extraction electrode.

  16. The effect of residual gas scattering on Ga ion beam patterning of graphene

    SciTech Connect (OSTI)

    Thissen, Nick F. W. E-mail: a.a.bol@tue.nl; Vervuurt, R. H. J.; Weber, J. W.; Kessels, W. M. M.; Bol, A. A. E-mail: a.a.bol@tue.nl; Mulders, J. J. L.

    2015-11-23

    The patterning of graphene by a 30 kV Ga{sup +} focused ion beam (FIB) is studied by in-situ and ex-situ Raman spectroscopy. It is found that the graphene surrounding the patterned target area can be damaged at remarkably large distances of more than 10 μm. We show that scattering of the Ga ions in the residual gas of the vacuum system is the main cause of the large range of lateral damage, as the size and shape of the tail of the ion beam were strongly dependent on the system background pressure. The range of the damage was therefore greatly reduced by working at low pressures and limiting the total amount of ions used. This makes FIB patterning a feasible alternative to electron beam lithography as long as residual gas scattering is taken into account.

  17. Dual ion beam assisted deposition of biaxially textured template layers

    DOE Patents [OSTI]

    Groves, James R.; Arendt, Paul N.; Hammond, Robert H.

    2005-05-31

    The present invention is directed towards a process and apparatus for epitaxial deposition of a material, e.g., a layer of MgO, onto a substrate such as a flexible metal substrate, using dual ion beams for the ion beam assisted deposition whereby thick layers can be deposited without degradation of the desired properties by the material. The ability to deposit thicker layers without loss of properties provides a significantly broader deposition window for the process.

  18. Maskless micro-ion-beam reduction lithography system

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Barletta, William A.; Patterson, David O.; Gough, Richard A.

    2005-05-03

    A maskless micro-ion-beam reduction lithography system is a system for projecting patterns onto a resist layer on a wafer with feature size down to below 100 nm. The MMRL system operates without a stencil mask. The patterns are generated by switching beamlets on and off from a two electrode blanking system or pattern generator. The pattern generator controllably extracts the beamlet pattern from an ion source and is followed by a beam reduction and acceleration column.

  19. Rapid Coarsening of Ion Beam Ripple Patterns by Defect Annihilation

    SciTech Connect (OSTI)

    Hansen, Henri; Messlinger, Sebastian; Stoian, Georgiana [I. Physikalisches Institut, RWTH Aachen, 52056 Aachen (Germany); Redinger, Alex [I. Physikalisches Institut, RWTH Aachen, 52056 Aachen (Germany); II. Physikalisches Institut, Universitaet zu Koeln, 50937 Koeln, Zuelpicher Strasse 77 (Germany); Krug, Joachim [Institut fuer Theoretische Physik, Universitaet zu Koeln, 50937 Koeln, Zuelpicher Strasse 77 (Germany); Michely, Thomas [II. Physikalisches Institut, Universitaet zu Koeln, 50937 Koeln, Zuelpicher Strasse 77 (Germany)

    2009-04-10

    Ripple patterns formed on Pt(111) through grazing incidence ion beam erosion coarsen rapidly. At and below 450 K coarsening of the patterns is athermal and kinetic, unrelated to diffusion and surface free energy. Similar to the situation for sand dunes, coarsening takes place through annihilation reactions of mobile defects in the pattern. The defect velocity derived on the basis of a simple model agrees quantitatively with the velocity of monatomic steps illuminated by the ion beam.

  20. An ion guide laser ion source for isobar-suppressed rare isotope beams

    SciTech Connect (OSTI)

    Raeder, Sebastian Ames, Friedhelm; Bishop, Daryl; Bricault, Pierre; Kunz, Peter; Mjs, Anders; Heggen, Henning; Institute of Applied Physics, TU Darmstadt, Schlossgartenstr. 7, 64289 Darmstadt ; Lassen, Jens Teigelhfer, Andrea; Department of Physics and Astronomy, University of Manitoba, Winnipeg, Manitoba R3T 2N2

    2014-03-15

    Modern experiments at isotope separator on-line (ISOL) facilities like ISAC at TRIUMF often depend critically on the purity of the delivered rare isotope beams. Therefore, highly selective ion sources are essential. This article presents the development and successful on-line operation of an ion guide laser ion source (IG-LIS) for the production of ion beams free of isobaric contamination. Thermionic ions from the hot ISOL target are suppressed by an electrostatic potential barrier, while neutral radio nuclides effusing out are resonantly ionized by laser radiation within a quadrupole ion guide behind this barrier. The IG-LIS was developed through detailed thermal and ion optics simulation studies and off-line tests with stable isotopes. In a first on-line run with a SiC target a suppression of surface-ionized Na contaminants in the ion beam of up to six orders of magnitude was demonstrated.

  1. Properties of dark solitons under SBS in focused beams

    SciTech Connect (OSTI)

    Bel'dyugin, Igor' M; Erokhin, A I; Efimkov, V F; Zubarev, I G; Mikhailov, S I

    2012-12-31

    Using the method of four-wave probing of the waist of the laser beam focused into the bulk of a short active medium (L || {tau}c, where L is the length of the active medium, {tau} is the pulse duration, and c is the speed of light), we have studied the dynamics of the behaviour of a dark soliton, appearing upon a jump of the input Stokes signal phase by about {pi} under SBS. The computer simulation has shown that when spontaneous noises with the gain increment {Gamma}, exceeding the self-reflection threshold by 2 - 3 times, are generated, the dark soliton propagates along the interaction region for the time t Almost-Equal-To T{sub 2}{Gamma}{sub th}/2, where T{sub 2} is the the lifetime of acoustic phonons, and {Gamma}{sub th} = 25 - 30 is the stationary threshold gain increment. (special issue devoted to the 90th anniversary of n.g. basov)

  2. A double-plasma source of continuous bipolar ion-ion beam

    SciTech Connect (OSTI)

    Dudin, S. V.; Scientific Center of Physical Technologies, Svobody sq. 6, 61022 Kharkiv ; Rafalskyi, D. V.

    2013-01-21

    A double-plasma source capable of the generation of a continuous bipolar ion-ion beam is described. The quasi-neutral ion-ion flow to an extraction electrode is formed in the system containing primary inductively coupled plasma separated from a secondary plasma by an electrostatic grid-type filter. The total current of each ion species to the 250 mm diameter extraction electrode is about 80 mA; the electron current does not exceed 30% of the ion current. Method of positive/negative ion current ratio control is proposed, allowing the ion currents ratio variation in wide range.

  3. Intense beams from gases generated by a permanent magnet ECR ion source at PKU

    SciTech Connect (OSTI)

    Ren, H. T.; Chen, J. E.; Peng, S. X.; Lu, P. N.; Yan, S.; Zhou, Q. F.; Zhao, J.; Yuan, Z. X.; Guo, Z. Y.

    2012-02-15

    An electron cyclotron resonance (ECR) ion source is designed for the production of high-current ion beams of various gaseous elements. At the Peking University (PKU), the primary study is focused on developing suitable permanent magnet ECR ion sources (PMECRs) for separated function radio frequency quadrupole (SFRFQ) accelerator and for Peking University Neutron Imaging Facility. Recently, other kinds of high-intensity ion beams are required for new acceleration structure demonstration, simulation of fusion reactor material irradiation, aviation bearing modification, and other applications. So we expanded the ion beam category from O{sup +}, H{sup +}, and D{sup +} to N{sup +}, Ar{sup +}, and He{sup +}. Up to now, about 120 mA of H{sup +}, 83 mA of D{sup +}, 50 mA of O{sup +}, 63 mA of N{sup +}, 70 mA of Ar{sup +}, and 65 mA of He{sup +} extracted at 50 kV through a {phi} 6 mm aperture were produced by the PMECRs at PKU. Their rms emittances are less than 0.2 {pi} mm mrad. Tungsten samples were irradiated by H{sup +} or He{sup +} beam extracted from this ion source and H/He holes and bubbles have been observed on the samples. A method to produce a high intensity H/He mixed beam to study synergistic effect is developed for nuclear material irradiation. To design a He{sup +} beam injector for coupled radio frequency quadruple and SFRFQ cavity, He{sup +} beam transmission experiments were carried out on PKU low energy beam transport test bench and the transmission was less than 50%. It indicated that some electrode modifications must be done to decrease the divergence of He{sup +} beam.

  4. The direct injection of intense ion beams from a high field electron cyclotron resonance ion source into a radio frequency quadrupole

    SciTech Connect (OSTI)

    Rodrigues, G. Kanjilal, D.; Roy, A.; Becker, R.; Baskaran, R.

    2014-02-15

    The ion current achievable from high intensity ECR sources for highly charged ions is limited by the high space charge. This makes classical extraction systems for the transport and subsequent matching to a radio frequency quadrupole (RFQ) accelerator less efficient. The direct plasma injection (DPI) method developed originally for the laser ion source avoids these problems and uses the combined focusing of the gap between the ion source and the RFQ vanes (or rods) and the focusing of the rf fields from the RFQ penetrating into this gap. For high performance ECR sources that use superconducting solenoids, the stray magnetic field of the source in addition to the DPI scheme provides focusing against the space charge blow-up of the beam. A combined extraction/matching system has been designed for a high performance ECR ion source injecting into an RFQ, allowing a total beam current of 10 mA from the ion source for the production of highly charged {sup 238}U{sup 40+} (1.33 mA) to be injected at an ion source voltage of 60 kV. In this design, the features of IGUN have been used to take into account the rf-focusing of an RFQ channel (without modulation), the electrostatic field between ion source extraction and the RFQ vanes, the magnetic stray field of the ECR superconducting solenoid, and the defocusing space charge of an ion beam. The stray magnetic field is shown to be critical in the case of a matched beam.

  5. Electron Gun For Multiple Beam Klystron Using Magnetic Focusing

    DOE Patents [OSTI]

    Ives, R. Lawrence; Miram, George; Krasnykh, Anatoly

    2004-07-27

    An RF device comprising a plurality of drift tubes, each drift tube having a plurality of gaps defining resonant cavities, is immersed in an axial magnetic field. RF energy is introduced at an input RF port at one of these resonant cavities and collected at an output RF port at a different RF cavity. A plurality of electron beams passes through these drift tubes, and each electron beam has an individual magnetic shaping applied which enables confined beam transport through the drift tubes.

  6. Beam Dynamics Design and Simulation in Ion Linear Accelerators (

    Energy Science and Technology Software Center (OSTI)

    2006-08-01

    Orginally, the ray tracing code TRACK has been developed to fulfill the many special requirements for the Rare Isotope Accelerator Facility known as RIA. Since no available beam-dynamics code met all the necessary requirements, modifications to the code TRACK were introduced to allow end-to-end (from the ion souce to the production target) simulations of the RIA machine, TRACK is a general beam-dynamics code and can be applied for the design, commissioning and operation of modernmore » ion linear accelerators and beam transport systems.« less

  7. Arc-based smoothing of ion beam intensity on targets

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Friedman, Alex

    2012-06-20

    Manipulating a set of ion beams upstream of a target, makes it possible to arrange a smoother deposition pattern, so as to achieve more uniform illumination of the target. A uniform energy deposition pattern is important for applications including ion-beam-driven high energy density physics and heavy-ion beam-driven inertial fusion energy (“heavy-ion fusion”). Here, we consider an approach to such smoothing that is based on rapidly “wobbling” each of the beams back and forth along a short arc-shaped path, via oscillating fields applied upstream of the final pulse compression. In this technique, uniformity is achieved in the time-averaged sense; this ismore » sufficient provided the beam oscillation timescale is short relative to the hydrodynamic timescale of the target implosion. This work builds on two earlier concepts: elliptical beams applied to a distributed-radiator target [D. A. Callahan and M. Tabak, Phys. Plasmas 7, 2083 (2000)] and beams that are wobbled so as to trace a number of full rotations around a circular or elliptical path [R. C. Arnold et al., Nucl. Instrum. Methods 199, 557 (1982)]. Here, we describe the arc-based smoothing approach and compare it to results obtainable using an elliptical-beam prescription. In particular, we assess the potential of these approaches for minimization of azimuthal asymmetry, for the case of a ring of beams arranged on a cone. We also found that, for small numbers of beams on the ring, the arc-based smoothing approach offers superior uniformity. In contrast with the full-rotation approach, arc-based smoothing remains usable when the geometry precludes wobbling the beams around a full circle, e.g., for the X-target [E. Henestroza, B. G. Logan, and L. J. Perkins, Phys. Plasmas 18, 032702 (2011)] and some classes of distributed-radiator targets.« less

  8. Shunting arc plasma source for pure carbon ion beam

    SciTech Connect (OSTI)

    Koguchi, H.; Sakakita, H.; Kiyama, S.; Shimada, T.; Sato, Y.; Hirano, Y.

    2012-02-15

    A plasma source is developed using a coaxial shunting arc plasma gun to extract a pure carbon ion beam. The pure carbon ion beam is a new type of deposition system for diamond and other carbon materials. Our plasma device generates pure carbon plasma from solid-state carbon material without using a hydrocarbon gas such as methane gas, and the plasma does not contain any hydrogen. The ion saturation current of the discharge measured by a double probe is about 0.2 mA/mm{sup 2} at the peak of the pulse.

  9. The APEX Project: Ion beam pulse-shaping experiments on Sandia Laboratories' Particle Beam Fusion Accelerator PBFA II

    SciTech Connect (OSTI)

    Crow, J.T.

    1987-01-01

    This paper discusses the development of ion beam pulse shaping, efficient extraction ion diodes, and efficient plasma channel transport for the particle beam fusion accelerator PBFA II. 10 refs. (LSP)

  10. Linac4 low energy beam measurements with negative hydrogen ions

    SciTech Connect (OSTI)

    Scrivens, R. Bellodi, G.; Crettiez, O.; Dimov, V.; Gerard, D.; Granemann Souza, E.; Guida, R.; Hansen, J.; Lallement, J.-B.; Lettry, J.; Lombardi, A.; Midttun, Ø.; Pasquino, C.; Raich, U.; Riffaud, B.; Roncarolo, F.; Valerio-Lizarraga, C. A.; Wallner, J.; Yarmohammadi Satri, M.; Zickler, T.

    2014-02-15

    Linac4, a 160 MeV normal-conducting H{sup −} linear accelerator, is the first step in the upgrade of the beam intensity available from the LHC proton injectors at CERN. The Linac4 Low Energy Beam Transport (LEBT) line from the pulsed 2 MHz RF driven ion source, to the 352 MHz RFQ (Radiofrequency Quadrupole) has been built and installed at a test stand, and has been used to transport and match to the RFQ a pulsed 14 mA H{sup −} beam at 45 keV. A temporary slit-and-grid emittance measurement system has been put in place to characterize the beam delivered to the RFQ. In this paper a description of the LEBT and its beam diagnostics is given, and the results of beam emittance measurements and beam transmission measurements through the RFQ are compared with the expectation from simulations.

  11. Ion emittance growth due to focusing modulation from slipping electron bunch

    SciTech Connect (OSTI)

    Wang, G.

    2015-02-17

    Low energy RHIC operation has to be operated at an energy ranging from γ = 4.1 to γ = 10. The energy variation causes the change of revolution frequency. While the rf system for the circulating ion will operate at an exact harmonic of the revolution frequency (h=60 for 4.5 MHz rf and h=360 for 28 MHz rf.), the superconducting rf system for the cooling electron beam does not have a frequency tuning range that is wide enough to cover the required changes of revolution frequency. As a result, electron bunches will sit at different locations along the ion bunch from turn to turn, i.e. the slipping of the electron bunch with respect to the circulating ion bunch. At cooling section, ions see a coherent focusing force due to the electrons’ space charge, which differs from turn to turn due to the slipping. We will try to estimate how this irregular focusing affects the transverse emittance of the ion bunch.

  12. HIGH ENERGY DENSITY PHYSICS EXPERIMENTS WITH INTENSE HEAVY ION BEAMS

    SciTech Connect (OSTI)

    Henestroza, E.; Leitner, M.; Logan, B.G.; More, R.M.; Roy, P.K.; Ni, P.; Seidl, P.A.; Waldron, W.L.; Barnard, J.J.

    2010-03-16

    The US heavy ion fusion science program has developed techniques for heating ion-beam-driven warm dense matter (WDM) targets. The WDM conditions are to be achieved by combined longitudinal and transverse space-charge neutralized drift compression of the ion beam to provide a hot spot on the target with a beam spot size of about 1 mm, and pulse length about 1-2 ns. As a technique for heating volumetric samples of matter to high energy density, intense beams of heavy ions are capable of delivering precise and uniform beam energy deposition dE/dx, in a relatively large sample size, and the ability to heat any solid-phase target material. Initial experiments use a 0.3 MeV K+ beam (below the Bragg peak) from the NDCX-I accelerator. Future plans include target experiments using the NDCX-II accelerator, which is designed to heat targets at the Bragg peak using a 3-6 MeV lithium ion beam. The range of the beams in solid matter targets is about 1 micron, which can be lengthened by using porous targets at reduced density. We have completed the fabrication of a new experimental target chamber facility for WDM experiments, and implemented initial target diagnostics to be used for the first target experiments in NDCX-1. The target chamber has been installed on the NDCX-I beamline. The target diagnostics include a fast multi-channel optical pyrometer, optical streak camera, VISAR, and high-speed gated cameras. Initial WDM experiments will heat targets by compressed NDCX-I beams and will explore measurement of temperature and other target parameters. Experiments are planned in areas such as dense electronegative targets, porous target homogenization and two-phase equation of state.

  13. HIGH ENERGY DENSITY PHYSICS EXPERIMENTS WITH INTENSE HEAVY ION BEAMS

    SciTech Connect (OSTI)

    Bieniosek, F.M.; Henestroza, E.; Leitner, M.; Logan, B.G.; More, R.M.; Roy, P.K.; Ni, P.; Seidl, P.A.; Waldron, W.L.; Barnard, J.J.

    2008-08-01

    The US heavy ion fusion science program has developed techniques for heating ion-beam-driven warm dense matter (WDM) targets. The WDM conditions are to be achieved by combined longitudinal and transverse space-charge neutralized drift compression of the ion beam to provide a hot spot on the target with a beam spot size of about 1 mm, and pulse length about 1-2 ns. As a technique for heating volumetric samples of matter to high energy density, intense beams of heavy ions are capable of delivering precise and uniform beam energy deposition dE/dx, in a relatively large sample size, and the ability to heat any solid-phase target material. Initial experiments use a 0.3 MeV K+ beam (below the Bragg peak) from the NDCX-I accelerator. Future plans include target experiments using the NDCX-II accelerator, which is designed to heat targets at the Bragg peak using a 3-6 MeV lithium ion beam. The range of the beams in solid matter targets is about 1 micron, which can be lengthened by using porous targets at reduced density. We have completed the fabrication of a new experimental target chamber facility for WDM experiments, and implemented initial target diagnostics to be used for the first target experiments in NDCX-1. The target chamber has been installed on the NDCX-I beamline. The target diagnostics include a fast multi-channel optical pyrometer, optical streak camera, VISAR, and high-speed gated cameras. Initial WDM experiments will heat targets by compressed NDCX-I beams and will explore measurement of temperature and other target parameters. Experiments are planned in areas such as dense electronegative targets, porous target homogenization and two-phase equation of state.

  14. Advanced ion beam calorimetry for the test facility ELISE

    SciTech Connect (OSTI)

    Nocentini, R. Fantz, U.; Franzen, P.; Fröschle, M.; Heinemann, B.; Riedl, R.; Ruf, B.; Wünderlich, D.; Bonomo, F.; Pimazzoni, A.; Pasqualotto, R.

    2015-04-08

    The negative ion source test facility ELISE (Extraction from a Large Ion Source Experiment) is in operation since beginning of 2013 at the Max-Planck-Institut für Plasmaphysik (IPP) in Garching bei München. The large radio frequency driven ion source of ELISE is about 1×1 m{sup 2} in size (1/2 the ITER source) and can produce a plasma for up to 1 h. Negative ions can be extracted and accelerated by an ITER-like extraction system made of 3 grids with an area of 0.1 m{sup 2}, for 10 s every 3 minutes. A total accelerating voltage of up to 60 kV is available, i.e. a maximum ion beam power of about 1.2 MW can be produced. ELISE is equipped with several beam diagnostic tools for the evaluation of the beam characteristics. In order to evaluate the beam properties with a high level of detail, a sophisticated diagnostic calorimeter has been installed in the test facility at the end of 2013, starting operation in January 2014. The diagnostic calorimeter is split into 4 copper plates with separate water calorimetry for each of the plates. Each calorimeter plate is made of 15×15 copper blocks, which act as many separate inertial calorimeters and are attached to a copper plate with an embedded cooling circuit. The block geometry and the connection with the cooling plate are optimized to accurately measure the time-averaged power of the 10 s ion beam. The surface of the blocks is covered with a black coating that allows infrared (IR) thermography which provides a 2D profile of the beam power density. In order to calibrate the IR thermography, 48 thermocouples are installed in as many blocks, arranged in two vertical and two horizontal rows. The paper describes the beam calorimetry in ELISE, including the methods used for the IR thermography, the water calorimetry and the analytical methods for beam profile evaluation. It is shown how the maximum beam inhomogeneity amounts to 13% in average. The beam divergence derived by IR thermography ranges between 1° and 4° and

  15. Temperature measurements during high flux ion beam irradiations

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Crespillo, Miguel L.; Graham, Joseph T.; Zhang, Yanwen; Weber, William J.

    2016-02-16

    A systematic study of the ion beam heating effect was performed in a temperature range of –170 to 900 °C using a 10 MeV Au3+ ion beam and a Yttria stabilized Zirconia (YSZ) sample at a flux of 5.5 × 1012 cm–2 s–1. Different geometric configurations of beam, sample, thermocouple positioning, and sample holder were compared to understand the heat/charge transport mechanisms responsible for the observed temperature increase. The beam heating exhibited a strong dependence on the background (initial) sample temperature with the largest temperature increases occurring at cryogenic temperatures and decreasing with increasing temperature. Comparison with numerical calculations suggestsmore » that the observed heating effect is, in reality, a predominantly electronic effect and the true temperature rise is small. Furthermore, a simple model was developed to explain this electronic effect in terms of an electrostatic potential that forms during ion irradiation. Such an artificial beam heating effect is potentially problematic in thermostated ion irradiation and ion beamanalysis apparatus, as the operation of temperature feedback systems can be significantly distorted by this effect.« less

  16. Impact of beam transport method on chamber and driver design for heavy ion inertial fusion energy

    SciTech Connect (OSTI)

    Rose, D.V.; Welch, D.R.; Olson, C.L.; Yu, S.S.; Neff, S.; Sharp, W.M.

    2002-12-01

    In heavy ion inertial fusion energy systems, intense beams of ions must be transported from the exit of the final focus magnet system through the target chamber to hit millimeter spot sizes on the target. In this paper, we examine three different modes of beam propagation: neutralized ballistic transport, assisted pinched transport, and self-pinched transport. The status of our understanding of these three modes is summarized, and the constraints imposed by beam propagation upon the chamber environment, as well as their compatibility with various chamber and target concepts, are considered. We conclude that, on the basis of our present understanding, there is a reasonable range of parameter space where beams can propagate in thick-liquid wall, wetted-wall, and dry-wall chambers.

  17. Ion beam modification of topological insulator bismuth selenide

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Sharma, Peter Anand; Sharma, A. L. Lima; Hekmaty, Michelle A.; Hattar, Khalid Mikhiel; Stavila, Vitalie; Goeke, Ronald S.; Erickson, K.; Medlin, Douglas L.; Brahlek, M.; Oh, S.; et al

    2014-12-17

    In this study, we demonstrate chemical doping of a topological insulator Bi2Se3 using ion implantation. Ion beam-induced structural damage was characterized using grazing incidence X-ray diffraction and transmission electron microscopy. Ion damage was reversed using a simple thermal annealing step. Carrier-type conversion was achieved using ion implantation followed by an activation anneal in Bi2Se3 thin films. These two sets of experiments establish the feasibility of ion implantation for chemical modification of Bi2Se3, a prototypical topological insulator. Ion implantation can, in principle, be used for any topological insulator. The direct implantation of dopants should allow better control over carrier concentrations formore » the purposes of achieving low bulk conductivity. Ion implantation also enables the fabrication of inhomogeneously doped structures, which in turn should make possible new types of device designs.« less

  18. Experimental evidences for emittance degradation by space charge effect when using a focusing solenoid below an electron cyclotron resonance ion source

    SciTech Connect (OSTI)

    Machicoane, G.; Doleans, M.; Stetson, J.; Wu, X.; Zavodszky, P. A.

    2008-02-15

    Solenoids are widely used to provide initial focusing of beams extracted from an ion source. However, in the case of an electron cyclotron resonance (ECR) ion source, the extracted beam will usually include different ion species and for each of them a wide distribution of charge states. When such a multicomponent beam is focused by a solenoid, the ions with a Q/A larger than the beam of interest are overfocused and usually go through a waist before reaching the analyzing magnet. If the beam currents obtained for these ions are sufficient, the resulting space charge forces can significantly degrade the emittance of the beam components with a lower Q/A and result for those in a hollow beam. Using a beam viewer and an emittance-measuring device, this paper reports on experimental findings that confirm the existence of such an effect for low charge states of argon. Moreover, by changing the experimental conditions of the ECR plasma in order to modify the charge state distribution of the extracted ion beam, it is shown that the threshold where this space charge effect starts to be significant can be changed.

  19. Production of N[sup +] ions from a multicusp ion beam apparatus

    DOE Patents [OSTI]

    Kango Leung; Kunkel, W.B.; Walther, S.R.

    1993-03-30

    A method of generating a high purity (at least 98%) N[sup +] ion beam using a multicusp ion source having a chamber formed by a cylindrical chamber wall surrounded by a plurality of magnets, a filament centrally disposed in said chamber, a plasma electrode having an extraction orifice at one end of the chamber, a magnetic filter having two parallel magnets spaced from said plasma electrode and dividing the chamber into arc discharge and extraction regions. The method includes ionizing nitrogen gas in the arc discharge region of the chamber, maintaining the chamber wall at a positive voltage relative to the filament and at a magnitude for an optimum percentage of N[sup +] ions in the extracted ion beams, disposing a hot liner within the chamber and near the chamber wall to limit recombination of N[sup +] ions into the N[sub 2][sup +] ions, spacing the magnets of the magnetic filter from each other for optimum percentage of N[sup 3] ions in the extracted ion beams, and maintaining a relatively low pressure downstream of the extraction orifice and of a magnitude (preferably within the range of 3-8[times]10[sup [minus]4] torr) for an optimum percentage of N[sup +] ions in the extracted ion beam.

  20. Production of N.sup.+ ions from a multicusp ion beam apparatus

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Kunkel, Wulf B.; Walther, Steven R.

    1993-01-01

    A method of generating a high purity (at least 98%) N.sup.+ ion beam using a multicusp ion source (10) having a chamber (11) formed by a cylindrical chamber wall (12) surrounded by a plurality of magnets (13), a filament (57) centrally disposed in said chamber, a plasma electrode (36) having an extraction orifice (41) at one end of the chamber, a magnetic filter having two parallel magnets (21, 22) spaced from said plasma electrode (36) and dividing the chamber (11) into arc discharge and extraction regions. The method includes ionizing nitrogen gas in the arc discharge region of the chamber (11), maintaining the chamber wall (12) at a positive voltage relative to the filament (57) and at a magnitude for an optimum percentage of N.sup.+ ions in the extracted ion beams, disposing a hot liner (45) within the chamber and near the chamber wall (12) to limit recombination of N.sup.+ ions into the N.sub.2.sup.+ ions, spacing the magnets (21, 22) of the magnetic filter from each other for optimum percentage of N.sup.3 ions in the extracted ion beams, and maintaining a relatively low pressure downstream of the extraction orifice and of a magnitude (preferably within the range of 3-8.times.10.sup.-4 torr) for an optimum percentage of N.sup.+ ions in the extracted ion beam.

  1. Cathode spot energy transfer simulated by a focused laser beam

    SciTech Connect (OSTI)

    Vogel, N.; Hoft, H. )

    1989-10-01

    Minimum conditions for the formation of surface craters by laser irradiation have been studied experimentally and theoretically for various metals. The critical power density for crater formation within 20 ns was about 10{sup 11}W/m{sup 2}. It is therefore concluded that crater formation by ion bombardment will require an ion current density of the order of 10{sup 10}A/m{sup 2}.

  2. Polarized Ion Beams in Figure-8 Rings of JLab's MEIC

    SciTech Connect (OSTI)

    Derbenev, Yaroslav; Lin, Fanglei; Morozov, Vasiliy; Zhang, Yuhong; Kondratenko, Anatoliy; Kondratenko, M.A.; Filatov, Yury

    2014-07-01

    The Medium-energy Electron-Ion Collider (MEIC) proposed by Jefferson Lab is designed to provide high polarization of both colliding beams. One of the unique features of JLab's MEIC is figure-8 shape of its rings. It allows preservation and control of polarization of all ion species including small-anomalous-magnetic-moment deuterons during their acceleration and storage. The figure-8 design conceptually expands the capability of obtaining polarized high-energy beams in comparison to conventional designs because of its property of having no preferred periodic spin direction. This allows one to control effectively the beam polarization by means of magnetic insertions with small field integrals. We present a complete scheme for preserving the ion polarization during all stages of acceleration and its control in the collider's experimental straights.

  3. Plasma and Ion Beam Injection into an FRC

    SciTech Connect (OSTI)

    Anderson, M.; Bystritskii, V.; Garate, E.; Rostoker, N.; Song, Y.; Drie, A. van; Binderbauer, M.; Isakov, I.

    2005-10-15

    Experiments on the transverse injection of intense (5-20 A/cm{sup 2}), wide cross-section (10-cm), neutralized, {approx}100-eV H{sup +} plasma and 100-keV H{sup +} ion beams into a preformed B-field reversed configuration (FRC) are described. The FRC background plasma temperature was {approx}5 eV with densities of {approx}10{sup 13} cm{sup -3}. In contrast to earlier experiments, the background plasma was generated by separate plasma gun arrays. For the startup of the FRC, a betatron-type 'slow' coaxial source was used. Injection of the plasma beam into the preformed FRC resulted in a 30-40% increase of the FRC lifetime and the amplitude of the reversed magnetic field. As for the ion beam injection experiment into the preformed FRC, there was evidence of beam capture within the configuration.

  4. ELECTRON BEAM ION SOURCE PREINJECTOR PROJECT (EBIS) CONCEPTUAL DESIGN REPORT.

    SciTech Connect (OSTI)

    ALESSI, J.; BARTON, D.; BEEBE, E.; GASSNER, D.; ET AL.

    2005-02-28

    This report describes a new heavy ion pre-injector for the Relativistic Heavy Ion Collider (RHIC) based on a high charge state Electron Beam Ion Source (EBIS), a Radio Frequency Quadrupole (RFQ) accelerator, and a short Linac. The highly successful development of an EBIS at BNL now makes it possible to replace the present pre-injector that is based on an electrostatic Tandem with a reliable, low maintenance Linac-based pre-injector. Linac-based pre-injectors are presently used at most accelerator and collider facilities with the exception of RHIC, where the required gold beam intensities could only be met with a Tandem until the recent EBIS development. EBIS produces high charge state ions directly, eliminating the need for the two stripping foils presently used with the Tandem. Unstable stripping efficiencies of these foils are a significant source of luminosity degradation in RHIC. The high reliability and flexibility of the new Linac-based pre-injector will lead to increased integrated luminosity at RHIC and is an essential component for the long-term success of the RHIC facility. This new pre-injector, based on an EBIS, also has the potential for significant future intensity increases and can produce heavy ion beams of all species including uranium beams and, as part of a future upgrade, might also be used to produce polarized {sup 3}He beams. These capabilities will be critical to the future luminosity upgrades and electron-ion collisions in RHIC. The new RFQ and Linac that are used to accelerate beams from the EBIS to an energy sufficient for injection into the Booster are both very similar to existing devices already in operation at other facilities. Injection into the Booster will occur at the same location as the existing injection from the Tandem.

  5. Means for obtaining a metal ion beam from a heavy-ion cyclotron source

    DOE Patents [OSTI]

    Hudson, E.D.; Mallory, M.L.

    1975-08-01

    A description is given of a modification to a cyclotron ion source used in producing a high intensity metal ion beam. A small amount of an inert support gas maintains the usual plasma arc, except that it is necessary for the support gas to have a heavy mass, e.g., xenon or krypton as opposed to neon. A plate, fabricated from the metal (or anything that can be sputtered) to be ionized, is mounted on the back wall of the ion source arc chamber and is bombarded by returning energetic low-charged gas ions that fail to cross the initial accelerating gap between the ion source and the accelerating electrode. Some of the atoms that are dislodged from the plate by the returning gas ions become ionized and are extracted as a useful beam of heavy ions. (auth)

  6. The heavy ion beam diagnostic for the tokamak ISTTOK

    SciTech Connect (OSTI)

    Cabral, J.A.C.; Malaquias, A.; Praxedes, A.; Toledo, W. van; Varandas, C.A.F. )

    1994-08-01

    In this paper the authors describe the heavy ion beam diagnostic for the tokamak ISTTOK, which has been designed to determine the temporal evolution of the plasma density, poloidal magnetic field and plasma potential profiles. This diagnostic makes use of a new type of high density caesium plasma source, a multiple cell detector and a fast data acquisition system. The authors describe the numerical code for trajectory and beam attenuation simulations, a method for the experimental determination of the poloidal field profile, the ion gun and the detection, control and data acquisition systems. Calibration tests and the first experimental results are presented.

  7. ELECTRON BEAM ION SOURCE PREINJECTOR PROJECT (EBIS) CONCEPTUAL DESIGN REPORT.

    SciTech Connect (OSTI)

    ALESSI, J.; BARTON, D.; BEEBE, E.; GASSNER, D.; GRANDINETTI, R.; HSEUH, H.; JAVIDFAR, A.; KPONOU, A.; LAMBIASE, R.; LESSARD, E.; LOCKEY, R.; LODESTRO, V.; MAPES, M.; MIRABELLA, D.; NEHRING, T.; OERTER, B.; PENDZICK, A.; PIKIN, A.; RAPARIA, D.; RITTER, J.; ROSER, T.; RUSSO, T.; SNYDSTRUP, L.; WILINSKI, M.; ZALTSMAN, A.; ZHANG, S.

    2005-09-01

    This report describes a new heavy ion pre-injector for the Relativistic Heavy Ion Collider (RHIC) based on a high charge state Electron Beam Ion Source (EBIS), a Radio Frequency Quadrupole (RFQ) accelerator, and a short Linear accelerator (Linac). The highly successful development of an EBIS at Brookhaven National Laboratory (BNL) now makes it possible to replace the present pre-injector that is based on an electrostatic Tandem with a reliable, low maintenance Linac-based pre-injector. Linac-based preinjectors are presently used at most accelerator and collider facilities with the exception of RHIC, where the required gold beam intensities could only be met with a Tandem until the recent EBIS development. EBIS produces high charge state ions directly, eliminating the need for the two stripping foils presently used with the Tandem. Unstable stripping efficiencies of these foils are a significant source of luminosity degradation in RHIC. The high reliability and flexibility of the new Linac-based pre-injector will lead to increased integrated luminosity at RHIC and is an essential component for the long-term success of the RHIC facility. This new pre-injector, based on an EBIS, also has the potential for significant future intensity increases and can produce heavy ion beams of all species including uranium beams and, as part of a future upgrade, might also be used to produce polarized {sup 3}He beams. These capabilities will be critical to the future luminosity upgrades and electron-ion collisions in RHIC. The proposed pre-injector system would also provide for a major enhancement in capability for the NASA Space Radiation Laboratory (NSRL), which utilizes heavy-ion beams from the RHIC complex. EBIS would allow for the acceleration of all important ion species for the NASA radiobiology program, such as, helium, argon, and neon which are unavailable with the present Tandem injector. In addition, the new system would allow for very rapid switching of ion species for

  8. Slit disk for modified faraday cup diagnostic for determining power density of electron and ion beams

    DOE Patents [OSTI]

    Teruya, Alan T.; Elmer; John W.; Palmer, Todd A.

    2011-03-08

    A diagnostic system for characterization of an electron beam or an ion beam includes an electrical conducting disk of refractory material having a circumference, a center, and a Faraday cup assembly positioned to receive the electron beam or ion beam. At least one slit in the disk provides diagnostic characterization of the electron beam or ion beam. The at least one slit is located between the circumference and the center of the disk and includes a radial portion that is in radial alignment with the center and a portion that deviates from radial alignment with the center. The electron beam or ion beam is directed onto the disk and translated to the at least one slit wherein the electron beam or ion beam enters the at least one slit for providing diagnostic characterization of the electron beam or ion beam.

  9. A high-performance electron beam ion source

    SciTech Connect (OSTI)

    Alessi,J.; Beebe, E.; Bellavia, S.; Gould, O.; Kponou, A.; Lambiase, R.; Lockey, R.; McCafferty, D.; Okamura, M.; Pikin, A. I.; Raparia, D.; Ritter, J.; Syndstrup, L.

    2009-06-08

    At Brookhaven National Laboratory, a high current Electron Beam Ion Source (EBIS) has been developed as part of a new preinjector that is under construction to replace the Tandem Van de Graaffs as the heavy ion preinjector for the RHIC and NASA experimental programs. This preinjector will produce milliampere-level currents of essentially any ion species, with q/A {ge} 1/6, in short pulses, for injection into the Booster synchrotron. In order to produce the required intensities, this EBIS uses a 10A electron gun, and an electron collector designed to handle 300 kW of pulsed electron beam power. The EBIS trap region is 1.5 m long, inside a 5T, 2m long, 8-inch bore superconducting solenoid. The source is designed to switch ion species on a pulse-to-pulse basis, at a 5 Hz repetition rate. Singly-charged ions of the appropriate species, produced external to the EBIS, are injected into the trap and confined until the desired charge state is reached via stepwise ionization by the electron beam. Ions are then extracted and matched into an RFQ, followed by a short IH Linac, for acceleration to 2 MeV/A, prior to injection into the Booster synchrotron. An overview of the preinjector is presented, along with experimental results from the prototype EBIS, where all essential requirements have already been demonstrated. Design features and status of construction of the final high intensity EBIS is also be presented.

  10. Microwave Ion Source and Beam Injection for an Accelerator-drivenNeutron Source

    SciTech Connect (OSTI)

    Vainionpaa, J.H.; Gough, R.; Hoff, M.; Kwan, J.W.; Ludewigt,B.A.; Regis, M.J.; Wallig, J.G.; Wells, R.

    2007-02-15

    An over-dense microwave driven ion source capable ofproducing deuterium (or hydrogen) beams at 100-200 mA/cm2 and with atomicfraction>90 percent was designed and tested with an electrostaticlow energy beam transport section (LEBT). This ion source wasincorporatedinto the design of an Accelerator Driven Neutron Source(ADNS). The other key components in the ADNS include a 6 MeV RFQaccelerator, a beam bending and scanning system, and a deuterium gastarget. In this design a 40 mA D+ beam is produced from a 6 mm diameteraperture using a 60 kV extraction voltage. The LEBT section consists of 5electrodes arranged to form 2 Einzel lenses that focus the beam into theRFQ entrance. To create the ECR condition, 2 induction coils are used tocreate ~; 875 Gauss on axis inside the source chamber. To prevent HVbreakdown in the LEBT a magnetic field clamp is necessary to minimize thefield in this region. Matching of the microwave power from the waveguideto the plasma is done by an autotuner. We observed significantimprovement of the beam quality after installing a boron nitride linerinside the ion source. The measured emittance data are compared withPBGUNS simulations.

  11. Customized atomic force microscopy probe by focused-ion-beam...

    Office of Scientific and Technical Information (OSTI)

    Department of Pediatrics, Division of Immunology, Allergy and Rheumatology, Stanford ... OSTI Identifier: 22314503 Resource Type: Journal Article Resource Relation: Journal Name: ...

  12. The uses of electron beam ion traps in the study of highly charged ions

    SciTech Connect (OSTI)

    Knapp, D.

    1994-11-02

    The Electron Beam Ion Trap (EBIT) is a relatively new tool for the study of highly charged ions. Its development has led to a variety of new experimental opportunities; measurements have been performed with EBITs using techniques impossible with conventional ion sources or storage rings. In this paper, I will highlight the various experimental techniques we have developed and the results we have obtained using the EBIT and higher-energy Super-EBIT built at the Lawrence Livermore National Laboratory. The EBIT employs a high-current-density electron beam to trap, ionize, and excite a population of ions. The ions can be studied in situ or extracted from the trap for external experiments. The trapped ions form an ionization-state equilibrium determined by the relative ionization and recombination rates. Ions of several different elements may simultaneously be present in the trap. The ions are nearly at rest, and, for most systems, all in their ground-state configurations. The electron-ion interaction energy has a narrow distribution and can be varied over a wide range. We have used the EBIT devices for the measurement of electron-ion interactions, ion structure, ion-surface interactions, and the behavior of low-density plasmas.

  13. Recent U.S. advances in ion-beam-driven high energy densityphysics and heavy ion fusion

    SciTech Connect (OSTI)

    Logan, B.G.; Bieniosek, F.M.; Celata, C.M.; Coleman, J.; Greenway, W.; Henestroza, E.; Kwan, J.W.; Lee, E.P.; Leitner, M.; Roy,P.K.; Seidl, P.A.; Vay, J-L.; Waldron, W.L.; Yu, S.S.; Barnard, J.J.; Cohen, R.H.; Friedman, A.; Grote, D.P.; Kireeff Covo, M.; Molvik, A.W.; Lund, S.M.; Meier, W.R.; Sharp, W.; Davidson, R.C.; Efthimion, P.C.; Gilson, E.P.; Grisham, L.; Kaganovich, Qin H.; Sefkow, A.B.; Startsev,E.A.; Welch, D.; Olson, C.

    2006-07-05

    During the past two years, significant experimental and theoretical progress has been made in the US heavy ion fusion science program in longitudinal beam compression, ion-beam-driven warm dense matter, beam acceleration, high brightness beam transport; and advanced theory and numerical simulations. Innovations in longitudinal compression of intense ion beams by > 50 X propagating through background plasma enable initial beam target experiments in warm dense matter to begin within the next two years. They are assessing how these new techniques might apply to heavy ion fusion drivers for inertial fusion energy.

  14. Stationary self-focusing of intense laser beam in cold quantum plasma using ramp density profile

    SciTech Connect (OSTI)

    Habibi, M.; Ghamari, F.

    2012-10-15

    By using a transient density profile, we have demonstrated stationary self-focusing of an electromagnetic Gaussian beam in cold quantum plasma. The paper is devoted to the prospects of using upward increasing ramp density profile of an inhomogeneous nonlinear medium with quantum effects in self-focusing mechanism of high intense laser beam. We have found that the upward ramp density profile in addition to quantum effects causes much higher oscillation and better focusing of laser beam in cold quantum plasma in comparison to that in the classical relativistic case. Our computational results reveal the importance and influence of formation of electron density profiles in enhancing laser self-focusing.

  15. Spin Observables in Reactions with Radioactive Ion Beams

    SciTech Connect (OSTI)

    Galindo-Uribarri, Alfredo {nmn}; Urrego Blanco, Juan Pablo

    2007-01-01

    Polarization observables in nuclear reactions with exotic nuclei will provide important information concerning structural properties of nuclei and reaction mechanisms. We are currently engaged in exploring the use of polarization observables with radioactive ion beams and in the development of a polarized cryogenic target.

  16. 21st International Conference on Ion Beam Analysis

    SciTech Connect (OSTI)

    Thevuthasan, Suntharampillai; Shutthanandan, V.; Wang, Yongqiang; Vizkelethy, Gyorgy; Rout, Bibhudutta

    2014-08-01

    This special issue of Nuclear Instruments and Methods in Physics Research B contains the proceedings of the 21st International Conference on Ion Beam Analysis (IBA 2013). This conference was held in Marriott Waterfront in Seattle, Washington, USA during June 2328, 2013.

  17. Use of radial self-field geometry for intense pulsed ion beam generation above 6 MeV on Hermes III.

    SciTech Connect (OSTI)

    Renk, Timothy Jerome; Harper-Slaboszewicz, Victor Jozef; Ginn, William Craig; Mikkelson, Kenneth A.; Schall, Michael; Cooper, Gary Wayne

    2012-12-01

    We investigate the generation and propagation of intense pulsed ion beams at the 6 MeV level and above using the Hermes III facility at Sandia National Laboratories. While high-power ion beams have previously been produced using Hermes III, we have conducted systematic studies of several ion diode geometries for the purpose of maximizing focused ion energy for a number of applications. A self-field axial-gap diode of the pinch reflex type and operated in positive polarity yielded beam power below predicted levels. This is ascribed both to power flow losses of unknown origin upstream of the diode load in Hermes positive polarity operation, and to anomalies in beam focusing in this configuration. A change to a radial self-field geometry and negative polarity operation resulted in greatly increased beam voltage (> 6 MeV) and estimated ion current. A comprehensive diagnostic set was developed to characterize beam performance, including both time-dependent and time-integrated measurements of local and total beam power. A substantial high-energy ion population was identified propagating in reverse direction, i.e. from the back side of the anode in the electron beam dump. While significant progress was made in increasing beam power, further improvements in assessing the beam focusing envelope will be required before ultimate ion generation efficiency with this geometry can be completely determined.

  18. Ion Beam Analysis of Targets Used in Controlatron Neutron Generators

    SciTech Connect (OSTI)

    Banks, James C.; Doyle, Barney L.; Walla, Lisa A.; Walsh, David S.

    2009-03-10

    Controlatron neutron generators are used for testing neutron detection systems at Sandia National Laboratories. To provide for increased tube lifetimes for the moderate neutron flux output of these generators, metal hydride (ZrT{sub 2}) target fabrication processes have been developed. To provide for manufacturing quality control of these targets, ion beam analysis techniques are used to determine film composition. The load ratios (i.e. T/Zr concentration ratios) of ZrT{sub 2} Controlatron neutron generator targets have been successfully measured by simultaneously acquiring RBS and ERD data using a He{sup ++} beam energy of 10 MeV. Several targets were measured and the film thicknesses obtained from RBS measurements agreed within {+-}2% with Dektak profilometer measurements. The target fabrication process and ion beam analysis techniques will be presented.

  19. Emittance growth of an nonequilibrium intense electron beam in a transport channel with discrete focusing

    SciTech Connect (OSTI)

    Carlsten, B.E.

    1997-02-01

    The author analyzes the emittance growth mechanisms for a continuous, intense electron beam in a focusing transport channel, over distances short enough that the beam does not reach equilibrium. The emittance grows from the effect of nonlinear forces arising from (1) current density nonuniformities, (2) energy variations leading to nonlinearities in the space-charge force even if the current density is uniform, (3) axial variations in the radial vector potential, (4) an axial velocity shear along the beam, and (5) an energy redistribution of the beam as the beam compresses or expands. The emittance growth is studied analytically and numerically for the cases of balanced flow, tight focusing, and slight beam scalloping, and is additionally studied numerically for an existing 6-MeV induction linear accelerator. Rules for minimizing the emittance along a beamline are established. Some emittance growth will always occur, both from current density nonuniformities that arise along the transport and from beam radius changes along the transport.

  20. US Heavy Ion Beam Research for High Energy Density Physics Applications and Fusion

    SciTech Connect (OSTI)

    Davidson, R.C.; Logan, B.G.; Barnard, J.J.; Bieniosek, F.M.; Briggs, R.J.; et al.

    2005-09-19

    Key scientific results from recent experiments, modeling tools, and heavy ion accelerator research are summarized that explore ways to investigate the properties of high energy density matter in heavy-ion-driven targets, in particular, strongly-coupled plasmas at 0.01 to 0.1 times solid density for studies of warm dense matter, which is a frontier area in high energy density physics. Pursuit of these near-term objectives has resulted in many innovations that will ultimately benefit heavy ion inertial fusion energy. These include: neutralized ion beam compression and focusing, which hold the promise of greatly improving the stage between the accelerator and the target chamber in a fusion power plant; and the Pulse Line Ion Accelerator (PLIA), which may lead to compact, low-cost modular linac drivers.

  1. (Ion beam deposition of epitaxial germanium and gallium arsenide layers): Foreign trip report, June 2, 1989--June 18, 1989

    SciTech Connect (OSTI)

    Haynes, T.E.

    1989-07-05

    The traveler presented an invited paper entitled ''Ion Beam Deposition of Epitaxial Germanium and Gallium Arsenide Layers'' at the Twelfth Symposium on Ion Sources and Ion-Assisted Technology (ISIAT '89) in Tokyo. During informal conversations at this meeting, the traveler was informed about a new Japanese initiative, sponsored by the Ministry of International Trade and Industry and an industrial consortium, to establish an Ion Engineering Research Center, whose purpose will be to provide sophisticated equipment and technology base for exploring and developing new applications of ion beam processing. The traveler also visited five Japanese laboratories involved in research on ion-solid interactions. Developments in ionized cluster beam (ICB) deposition were emphasized at ISIAT '89 and during visits to Kyoto University, where the ICB technique was pioneered, and to Mitsubishi Electric's Itami Works, where commercial ICB systems are now being produced. Discussions at Osaka University concentrated on the application of focused ion beams for maskless patterning of submicron devices and on recent studies of one- dimensional quantum effects in semiconductor wires. At Hitachi Research Laboratory, basic research on thin-film growth was described, as well as progress toward the development of a variable frequency RF quadrupole accelerator for ion implantation. Researchers at JAERI outlined programs in characterization and thin-film deposition of superconductors and in materials science studies using high-energy ion beams.

  2. Electrostatic dispersion lenses and ion beam dispersion methods

    DOE Patents [OSTI]

    Dahl, David A. [Idaho Falls, ID; Appelhans, Anthony D. [Idaho Falls, ID

    2010-12-28

    An EDL includes a case surface and at least one electrode surface. The EDL is configured to receive through the EDL a plurality of ion beams, to generate an electrostatic field between the one electrode surface and either the case surface or another electrode surface, and to increase the separation between the beams using the field. Other than an optional mid-plane intended to contain trajectories of the beams, the electrode surface or surfaces do not exhibit a plane of symmetry through which any beam received through the EDL must pass. In addition or in the alternative, the one electrode surface and either the case surface or the other electrode surface have geometries configured to shape the field to exhibit a less abrupt entrance and/or exit field transition in comparison to another electrostatic field shaped by two nested, one-quarter section, right cylindrical electrode surfaces with a constant gap width.

  3. Negative hydrogen ion beam extraction from an AC heated cathode driven Bernas-type ion source

    SciTech Connect (OSTI)

    Okano, Y.; Miyamoto, N.; Kasuya, T.; Wada, M.

    2015-04-08

    A plasma grid structure was installed to a Bernas-type ion source used for ion implantation equipment. A negative hydrogen (H{sup −}) ion beam was extracted by an AC driven ion source by adjusting the bias to the plasma grid. The extracted electron current was reduced by positively biasing the plasma grid, while an optimum plasma grid bias voltage for negative ion beam extraction was found to be positive 3 V with respect to the arc chamber. Source operations with AC cathode heating show extraction characteristics almost identical to that with DC cathode heating, except a minute increase in H{sup −} current at higher frequency of cathode heating current.

  4. Electrostatic energy analyzer measurements of low energy zirconium beam parameters in a plasma sputter-type negative ion source

    SciTech Connect (OSTI)

    Malapit, Giovanni M.; Mahinay, Christian Lorenz S.; Poral, Matthew D.; Ramos, Henry J.

    2012-02-15

    A plasma sputter-type negative ion source is utilized to produce and detect negative Zr ions with energies between 150 and 450 eV via a retarding potential-type electrostatic energy analyzer. Traditional and modified semi-cylindrical Faraday cups (FC) inside the analyzer are employed to sample negative Zr ions and measure corresponding ion currents. The traditional FC registered indistinct ion current readings which are attributed to backscattering of ions and secondary electron emissions. The modified Faraday cup with biased repeller guard ring, cut out these signal distortions leaving only ringings as issues which are theoretically compensated by fitting a sigmoidal function into the data. The mean energy and energy spread are calculated using the ion current versus retarding potential data while the beam width values are determined from the data of the transverse measurement of ion current. The most energetic negative Zr ions yield tighter energy spread at 4.11 eV compared to the least energetic negative Zr ions at 4.79 eV. The smallest calculated beam width is 1.04 cm for the negative Zr ions with the highest mean energy indicating a more focused beam in contrast to the less energetic negative Zr ions due to space charge forces.

  5. Method for measuring and controlling beam current in ion beam processing

    DOE Patents [OSTI]

    Kearney, Patrick A.; Burkhart, Scott C.

    2003-04-29

    A method for producing film thickness control of ion beam sputter deposition films. Great improvements in film thickness control is accomplished by keeping the total current supplied to both the beam and suppressor grids of a radio frequency (RF) in beam source constant, rather than just the current supplied to the beam grid. By controlling both currents, using this method, deposition rates are more stable, and this allows the deposition of layers with extremely well controlled thicknesses to about 0.1%. The method is carried out by calculating deposition rates based on the total of the suppressor and beam currents and maintaining the total current constant by adjusting RF power which gives more consistent values.

  6. Separation of beam and electrons in the spallation neutron source H{sup -} ion source

    SciTech Connect (OSTI)

    Whealton, J.H.; Raridon, R.J.; Leung, K.N.

    1997-12-01

    The Spallation Neutron Source (SNS) requires an ion source producing an H{sup {minus}} beam with a peak current of 35mA at a 6.2 percent duty factor. For the design of this ion source, extracted electrons must be transported and dumped without adversely affecting the H{sup {minus}} beam optics. Two issues are considered: (1) electron containment transport and controlled removal; and (2) first-order H{sup {minus}} beam steering. For electron containment, various magnetic, geometric and electrode biasing configurations are analyzed. A kinetic description for the negative ions and electrons is employed with self-consistent fields obtained from a steady-state solution to Poisson`s equation. Guiding center electron trajectories are used when the gyroradius is sufficiently small. The magnetic fields used to control the transport of the electrons and the asymmetric sheath produced by the gyrating electrons steer the ion beam. Scenarios for correcting this steering by split acceleration and focusing electrodes will be considered in some detail.

  7. Development of ion beam figuring system with electrostatic deflection for ultraprecise X-ray reflective optics

    SciTech Connect (OSTI)

    Yamada, Jumpei; Matsuyama, Satoshi Sano, Yasuhisa; Yamauchi, Kazuto

    2015-09-15

    We developed an ion beam figuring system that utilizes electrostatic deflection. The system can produce an arbitrary shape by deterministically scanning the ion beam. The scan of the ion beam, which can be precisely controlled using only an electrical signal, enables us to avoid degradation of the mirror shape caused by imperfect acceleration or deceleration of a mechanically scanning stage. Additionally, this surface figuring method can easily be combined with X-ray metrology because the workpiece remains fixed during the figuring. We evaluated the figuring accuracy of the system by fabricating a plano-elliptical mirror for X-ray focusing. A mirror with a shape error of 1.4 nm root mean square (RMS) with a maximum removal depth of 992 nm, which corresponds to figuring accuracy of 0.14% RMS, was achieved. After the second shape corrections, an elliptical shape with a shape error of approximately 1 nm peak-to-valley, 0.48 nm RMS could be fabricated. Then, the mirror surface was smoothed by a low-energy ion beam. Consequently, a micro-roughness of 0.117 nm RMS, measured by atomic force microscopy, was achieved over an area of 1 × 1 μm{sup 2}.

  8. Production of low axial energy spread ion beams with multicusp sources

    SciTech Connect (OSTI)

    Lee, Y.H.Y.

    1998-05-01

    Multicusp ion sources are capable of producing ions with low axial energy spread which are necessary in applications such as: ion projection lithography (IPL) and focused ion beams for the next generation lithographic tools and nuclear science experiments such as radioactive ion beam production. The axial ion energy spread for multicusp source is approximately 6 eV which is too large for IPL and radioactive ion beam applications. The addition of a magnetic filter which consists of a pair of permanent magnets to the multicusp source reduces the energy spread considerably. The reduction is due to the improvement in the uniformity of the axial plasma potential distribution in the discharge region. Axial ion energy spread of the filament driven ion source has been measured using three different techniques. In all cases, it was found to be less than 2 eV. Energy spread of the radio frequency (RF) driven source has also been explored, and it was found to be less than 3 eV with the proper RF-shielding. A new multicusp source configuration has been designed and constructed to further reduce the energy spread. To achieve a more uniform axial plasma potential distribution, a cylindrical magnetic filter has been designed and constructed for a 2-cm-diameter source. This new source configuration, the co-axial source, is new in its kind. The energy spread in this source has been measured to be a record low of 0.6 eV. Because of the novelty of this device, some plasma parameters inside the source have been studied. Langmuir probe has been used to measure the plasma potential, the electron temperature and the density distribution.

  9. First Beam Waist Measurements in the Final Focus Beam Line at...

    Office of Scientific and Technical Information (OSTI)

    to the design, to limit effects from higher-order optical aberrations and hence simplify beam tuning procedures while key instrumentation was being tested and calibrated. ...

  10. Three-dimensional light distribution near the focus of a tightly focused beam of few-cycle optical pulses

    SciTech Connect (OSTI)

    Romallosa, Kristine Marie; Bantang, Johnrob; Saloma, Caesar

    2003-09-01

    Via the Richards-Wolf vector diffraction theory, we analyze the three-dimensional intensity distribution of the focal volume that is produced by a strongly focused 750-nm beam of ultrafast, Gaussian-shaped optical pulses (10{sup -9} s{>=} pulse width {tau}{>=}1 fs=10{sup -15} s). Knowledge of the three-dimensional distribution near focus is essential in determining the diffraction-limited resolution of an optical microscope. The optical spectrum of a short pulse is characterized by side frequencies about the carrier frequency. The effect of spectral broadening on the focused intensity distribution is evaluated via the Linfoot's criteria of fidelity, structural content, and correlation quality and with reference to a 750-nm cw focused beam. Different values are considered for {tau} and numerical aperture of the focusing lens (0.1{<=}X{sub NA}{<=}1.2). At X{sub NA}=0.8, rapid deterioration of the focused intensity distribution is observed at {tau}=1.2 fs. This happens because a 750-nm optical pulse with {tau}=1.2 fs has an associated coherence length of 359.7 nm which is less than the Nyquist sampling interval of 375 nm that is required to sample 750 nm sinusoid without loss of information. The ill-effects of spectral broadening is weaker in two-photon excitation microscope than in its single-photon counterpart for the same focusing lens and light source.

  11. Optimizing the emission, propagation, and focusing of an intense electron beam

    SciTech Connect (OSTI)

    Pepitone, K. Gardelle, J. Modin, P.

    2015-05-14

    Intense electron beams can be used to study the dynamical response of materials under shocks in order to adjust the models developed for hydrodynamics simulations. We present in this paper a characterization of beams produced in a field emission diode coupled to the generator RKA at CEA/CESTA. Cherenkov emission, produced by the beam interacting in a fused silica disk, was observed by fast optical cameras to estimate beam homogeneity. GEANT4 simulations were performed to estimate the transfer function of the silica target and to optimize the anode foil. First, we chose the best cathode material available among the most common materials used in field emission systems. In addition, we found that by optimization of the anode thickness, we could improve the spatial homogeneity of the beam which is of prime importance for computing the interaction of the beam with materials. Next, we changed the beam fluence by increasing the beam current and by reducing the beam radius. Finally, we studied the propagation and focusing of the electron beam in low pressure gases and observed that we could use self-magnetic field focusing in order to increase beam fluence at the target location. The experimental results are in good agreement with PIC simulations.

  12. First test of BNL electron beam ion source with high current density electron beam

    SciTech Connect (OSTI)

    Pikin, Alexander Alessi, James G. Beebe, Edward N.; Shornikov, Andrey; Mertzig, Robert; Wenander, Fredrik; Scrivens, Richard

    2015-01-09

    A new electron gun with electrostatic compression has been installed at the Electron Beam Ion Source (EBIS) Test Stand at BNL. This is a collaborative effort by BNL and CERN teams with a common goal to study an EBIS with electron beam current up to 10 A, current density up to 10,000 A/cm{sup 2} and energy more than 50 keV. Intensive and pure beams of heavy highly charged ions with mass-to-charge ratio < 4.5 are requested by many heavy ion research facilities including NASA Space Radiation Laboratory (NSRL) at BNL and HIE-ISOLDE at CERN. With a multiampere electron gun, the EBIS should be capable of delivering highly charged ions for both RHIC facility applications at BNL and for ISOLDE experiments at CERN. Details of the electron gun simulations and design, and the Test EBIS electrostatic and magnetostatic structures with the new electron gun are presented. The experimental results of the electron beam transmission are given.

  13. Advanced techniques for characterization of ion beam modified materials

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhang, Yanwen; Debelle, Aurélien; Boulle, Alexandre; Kluth, Patrick; Tuomisto, Filip

    2014-10-30

    Understanding the mechanisms of damage formation in materials irradiated with energetic ions is essential for the field of ion-beam materials modification and engineering. Utilizing incident ions, electrons, photons, and positrons, various analysis techniques, including Rutherford backscattering spectrometry (RBS), electron RBS, Raman spectroscopy, high-resolution X-ray diffraction, small-angle X-ray scattering, and positron annihilation spectroscopy, are routinely used or gaining increasing attention in characterizing ion beam modified materials. The distinctive information, recent developments, and some perspectives in these techniques are reviewed in this paper. Applications of these techniques are discussed to demonstrate their unique ability for studying ion-solid interactions and the corresponding radiationmore » effects in modified depths ranging from a few nm to a few tens of μm, and to provide information on electronic and atomic structure of the materials, defect configuration and concentration, as well as phase stability, amorphization and recrystallization processes. Finally, such knowledge contributes to our fundamental understanding over a wide range of extreme conditions essential for enhancing material performance and also for design and synthesis of new materials to address a broad variety of future energy applications.« less

  14. Temporal Development of Ion Beam Mean Charge State in PulsedVacuum Arc Ion Sources

    SciTech Connect (OSTI)

    Oks, Efim M.; Yushkov, Georgy Yu.; Anders, Andre

    2007-06-21

    Vacuum arc ion sources, commonly also known as "Mevva" ionsources, are used to generate intense pulsed metal ion beams. It is knownthat the mean charge state of the ion beam lies between 1 and 4,depending on cathode material, arc current, arc pulse duration, presenceor absence of magnetic field at the cathode, as well background gaspressure. A characteristic of the vacuum arc ion beam is a significantdecrease in ion charge state throughout the pulse. This decrease can beobserved up to a few milliseconds, until a "noisy" steady-state value isestablished. Since the extraction voltage is constant, a decrease in theion charge state has a proportional impact on the average ion beamenergy. This paper presents results of detailed investigations of theinfluence of arc parameters on the temporal development of the ion beammean charge state for a wide range of cathode materials. It is shown thatfor fixed pulse duration, the charge state decrease can be reduced bylower arc current, higher pulse repetition rate, and reduction of thedistance between cathode and extraction region. The latter effect may beassociated with charge exchange processes in the dischargeplasma.

  15. Angular distribution of energetic argon ions emitted by a 90 kJ Filippov-type plasma focus

    SciTech Connect (OSTI)

    Pestehe, S. J.; Mohammadnejad, M.

    2015-02-15

    Characteristics of the energetic argon ions emitted by a 90 kJ Filippov-type plasma focus are studied by employing an array of Faraday cups. The Faraday cups are designed to minimize the secondary electron emission effects on their response. Angular distribution of the ions is measured, and the results indicate a highly anisotropic emission with a dip at the device axis and a local maximum at the angle of 7° with respect to the axis. It has been argued that this kind of anisotropic emission may be related to the surfatron acceleration mechanism and shown that this behavior is independent of the working gas pressure. It has been also demonstrated that this mechanism is responsible for the generation of MeV ions. Measuring the total ion number at different working gas pressures gives an optimum pressure of 0.3 Torr. In addition, the energy spectrum of ions is measured by taking into account of the ambient gas effects on the energy and charge of the ions. The current neutralization effect of electrons trapped in the ion beam as well as the effect of conducting boundaries surrounding the beam, on the detected signals are investigated.

  16. Means for the focusing and acceleration of parallel beams of charged particles. [Patent application

    DOE Patents [OSTI]

    Maschke, A.W.

    1980-09-23

    Apparatus for focusing beams of charged particles comprising planar arrays of electrostatic quadrupoles. The array may be assembled from a single component which comprises a support plate containing uniform rows of poles. Each pole is separated by a hole through the plate designed to pass a beam. Two such plates may be positioned with their poles intermeshed to form a plurality of quadrupoles.

  17. Means for the focusing and acceleration of parallel beams of charged particles

    DOE Patents [OSTI]

    Maschke, Alfred W.

    1982-09-21

    Apparatus for focusing beams of charged particles comprising planar arrays of electrostatic quadrupoles. The array may be assembled from a single component which comprises a support plate containing uniform rows of poles. Each pole is separated by a hole through the plate designed to pass a beam. Two such plates may be positioned with their poles intermeshed to form a plurality of quadrupoles.

  18. Versatile atomic force microscopy setup combined with micro-focused X-ray beam

    SciTech Connect (OSTI)

    Slobodskyy, T. Tholapi, R.; Liefeith, L.; Hansen, W.; Zozulya, A. V. Fester, M.; Sprung, M.

    2015-06-15

    Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.

  19. Measurement of ion beam from laser ion source for RHIC EBIS.

    SciTech Connect (OSTI)

    Kanesue,T.; Tamura, J.; Okamura, M.

    2008-06-23

    Laser ion source (LIS) is a candidate of the primary ion source for the RHIC EBIS. LIS will provide intense charge state 1+ ions to the EBIS for further ionization. We measured plasma properties of a variety of atomic species from C to Au using the second harmonics of Nd:YAG laser (532 nm wave length, up to 0.5 J/6 ns). Since properties of laser produced plasma is different from different species, laser power density for singly charged ion production should be verified experimentally for each atomic species. After plasma analysis experiments, Au ions was extracted from plasma and emittance of the ion beam was measured using a pepper pot type emittance monitor.

  20. Dose response of alanine detectors irradiated with carbon ion beams

    SciTech Connect (OSTI)

    Herrmann, Rochus; Jaekel, Oliver; Palmans, Hugo; Sharpe, Peter; Bassler, Niels

    2011-04-15

    Purpose: The dose response of the alanine detector shows a dependence on particle energy and type when irradiated with ion beams. The purpose of this study is to investigate the response behavior of the alanine detector in clinical carbon ion beams and compare the results to model predictions. Methods: Alanine detectors have been irradiated with carbon ions with an energy range of 89-400 MeV/u. The relative effectiveness of alanine has been measured in this regime. Pristine and spread out Bragg peak depth-dose curves have been measured with alanine dosimeters. The track structure based alanine response model developed by Hansen and Olsen has been implemented in the Monte Carlo code FLUKA and calculations were compared to experimental results. Results: Calculations of the relative effectiveness deviate less than 5% from the measured values for monoenergetic beams. Measured depth-dose curves deviate from predictions in the peak region, most pronounced at the distal edge of the peak. Conclusions: The used model and its implementation show a good overall agreement for quasimonoenergetic measurements. Deviations in depth-dose measurements are mainly attributed to uncertainties of the detector geometry implemented in the Monte Carlo simulations.

  1. Optimized electrode placement along the channel of a Hall thruster for ion focusing

    SciTech Connect (OSTI)

    Qing, Shaowei, E-mail: qshaowei@gmail.com [Power Engineering Institute, Chongqing University, Chongqing 400044 (China); E, Peng [Department of Electrical Engineering, Harbin Institute of Technology, Harbin 150001 (China); Xia, Guangqing [State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology, Dalian 116024 (China); Tang, Ming-Chun [College of Communication Engineering, Chongqing University, Chongqing 400044 (China); Duan, Ping [School of Physics, Dalian Maritime University, Dalian 116026 (China)

    2014-01-21

    An optimal placement of the segmented electrode for increasing the lifetime of the Aton-type Hall thruster, i.e., reducing the plume divergence, is demonstrated using a 2D3V fully kinetic Particle-in-Cell method. Segmented electrodes, embedded near the ionization region of non-segmented case and biased above anode potential, lead to an increased separation between the ionization and acceleration regions and the formation of an efficient acceleration electric field configuration as potential lens. Due to this electrode placement, the sheath near the ceramic walls of the acceleration region is collapsed and an excellent ion beam focusing is demonstrated. The potential contour pockets around the electrodes and the sheath collapse phenomenon are also discussed.

  2. Generation and diagnostics of pulsed intense ion beams with an energy density of 10 J/cm{sup 2}

    SciTech Connect (OSTI)

    Isakova, Yu. Pushkarev, A.; Khailov, I.; Zhong, H.

    2015-07-15

    The paper presents the results of a study on transportation and focusing of a pulsed ion beam at gigawatt power level, generated by a diode with explosive-emission cathode. The experiments were carried out with the TEMP-4M accelerator operating in double-pulse mode: the first pulse is of negative polarity (500 ns, 100-150 kV), and this is followed by a second pulse of positive polarity (120 ns, 200-250 kV). To reduce the beam divergence, we modified the construction of the diode. The width of the anode was increased compared to that of the cathode. We studied different configurations of planar and focusing strip diodes. It was found that the divergence of the ion beam formed by a planar strip diode, after construction modification, does not exceed 3° (half-angle). Modification to the construction of a focusing diode made it possible to reduce the beam divergence from 8° to 4°-5°, as well as to increase the energy density at the focus up to 10-12 J/cm{sup 2}, and decrease the shot to shot variation in the energy density from 10%-15% to 5%-6%. When measuring the ion beam energy density above the ablation threshold of the target material (3.5-4 J/cm{sup 2}), we used a metal mesh with 50% transparency to lower the energy density. The influence of the metal mesh on beam transport has been studied.

  3. Dynamics of ion beam charge neutralization by ferroelectric plasma sources

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Stepanov, Anton D.; Gilson, Erik P.; Grisham, Larry R.; Kaganovich, Igor D.; Davidson, Ronald C.

    2016-04-27

    Ferroelectric Plasma Sources (FEPSs) can generate plasma that provides effective space-charge neutralization of intense high-perveance ion beams, as has been demonstrated on the Neutralized Drift Compression Experiment NDCX-I and NDCX-II. This article presents experimental results on charge neutralization of a high-perveance 38 keV Ar+ beam by a plasma produced in a FEPS discharge. By comparing the measured beam radius with the envelope model for space-charge expansion, it is shown that a charge neutralization fraction of 98% is attainable with sufficiently dense FEPS plasma. The transverse electrostatic potential of the ion beam is reduced from 15V before neutralization to 0.3 V,more » implying that the energy of the neutralizing electrons is below 0.3 eV. Measurements of the time-evolution of beam radius show that near-complete charge neutralization is established similar to –5 μs after the driving pulse is applied to the FEPS and can last for 35 μs. It is argued that the duration of neutralization is much longer than a reasonable lifetime of the plasma produced in the sub-mu s surface discharge. Measurements of current flow in the driving circuit of the FEPS show the existence of electron emission into vacuum, which lasts for tens of mu s after the high voltage pulse is applied. Lastly, it is argued that the beam is neutralized by the plasma produced by this process and not by a surface discharge plasma that is produced at the instant the high-voltage pulse is applied.« less

  4. Collision Processes of Highly Charged Ions with Electrons Studied with an Electron Beam Ion Trap

    SciTech Connect (OSTI)

    Nakamura, Nobuyuki; Watanabe, Tsutomu; Ohtani, Shunsuke; Kavanagh, Anthony P.; Currell, Fred J.; Watanabe, Hirofumi; Sakaue, Hiroyuki A.; Kato, Daiji; Li Yueming; Tong Xiaoming

    2009-09-10

    The electron beam ion trap in Tokyo (Tokyo-EBIT)is suitable for studying relativistic effects in the collisions of highly charged heavy ions with electrons because it can produce and trap very highly charged heavy ions which interact with a mono-energetic and unidirectional relativistic electron beam with an energy of up to 200 keV. Recently, we have been studying resonant processes in ionization and recombination by measuring the charge abundance inside the EBIT at the equilibrium. The abundance ratio between adjacent charge states varies slowly with the electron energy when there is no resonant process. However, when the electron energy coincides with the resonant energy at which ionization or recombination is enhanced, the abundance ratio can drastically change. Thus, the resonant processes can be studied by measuring the abundance ratio between adjacent ions as a function of electron beam energy. In this talk, recent progress for heavy ions with very high charge states up to He-like Bi{sup 81+}, is presented. For such ions, relativistic effects significantly affect the resonant processes. For example, the generalized Breit interaction (GBI) effect, which treats the retardation in the exchange of single virtual photon between the free and orbital electrons, has been clearly observed in the DR resonant strength in Li-like Bi{sup 80+}. Recently we have also found that the GBI effect plays an important role in the interference between non-resonant and resonant recombinations. Experimental results are presented in comparison with theoretical calculations.

  5. Reduction of Glass Surface Reflectance by Ion Beam Surface Modification

    SciTech Connect (OSTI)

    Mark Spitzer

    2011-03-11

    This is the final report for DOE contract DE-EE0000590. The purpose of this work was to determine the feasibility of the reduction of the reflection from the front of solar photovoltaic modules. Reflection accounts for a power loss of approximately 4%. A solar module having an area of one square meter with an energy conversion efficiency of 18% generates approximately 180 watts. If reflection loss can be eliminated, the power output can be increased to 187 watts. Since conventional thin-film anti-reflection coatings do not have sufficient environmental stability, we investigated the feasibility of ion beam modification of the glass surface to obtain reduction of reflectance. Our findings are generally applicable to all solar modules that use glass encapsulation, as well as commercial float glass used in windows and other applications. Ion implantation of argon, fluorine, and xenon into commercial low-iron soda lime float glass, standard float glass, and borosilicate glass was studied by implantation, annealing, and measurement of reflectance. The three ions all affected reflectance. The most significant change was obtained by argon implantation into both low-iron and standard soda-lime glass. In this way samples were formed with reflectance lower than can be obtained with a single-layer coatings of magnesium fluoride. Integrated reflectance was reduced from 4% to 1% in low-iron soda lime glass typical of the glass used in solar modules. The reduction of reflectance of borosilicate glass was not as large; however borosilicate glass is not typically used in flat plate solar modules. Unlike conventional semiconductor ion implantation doping, glass reflectance reduction was found to be tolerant to large variations in implant dose, meaning that the process does not require high dopant uniformity. Additionally, glass implantation does not require mass analysis. Simple, high current ion implantation equipment can be developed for this process; however, before the process

  6. Optics measurement and correction during beam acceleration in the Relativistic Heavy Ion Collider

    SciTech Connect (OSTI)

    Liu, C.; Marusic, A.; Minty, M.

    2014-09-09

    To minimize operational complexities, setup of collisions in high energy circular colliders typically involves acceleration with near constant β-functions followed by application of strong focusing quadrupoles at the interaction points (IPs) for the final beta-squeeze. At the Relativistic Heavy Ion Collider (RHIC) beam acceleration and optics squeeze are performed simultaneously. In the past, beam optics correction at RHIC has taken place at injection and at final energy with some interpolation of corrections into the acceleration cycle. Recent measurements of the beam optics during acceleration and squeeze have evidenced significant beta-beats which if corrected could minimize undesirable emittance dilutions and maximize the spin polarization of polarized proton beams by avoidance of higher-order multipole fields sampled by particles within the bunch. In this report the methodology now operational at RHIC for beam optics corrections during acceleration with simultaneous beta-squeeze will be presented together with measurements which conclusively demonstrate the superior beam control. As a valuable by-product, the corrections have minimized the beta-beat at the profile monitors so reducing the dominant error in and providing more precise measurements of the evolution of the beam emittances during acceleration.

  7. Scattering of a tightly focused beam by an optically trapped particle

    SciTech Connect (OSTI)

    Lock, James A.; Wrbanek, Susan Y.; Weiland, Kenneth E

    2006-05-20

    Near-forward scattering of an optically trapped 5-{mu}m-radius polystyrene latex sphere by the trapping beam was examined both theoretically and experimentally. Since the trapping beam is tightly focused, the beam fields superpose and interfere with the scattered fields in the forward hemisphere. The observed light intensity consists of a series of concentric bright and dark fringes centered about the forward-scattering direction. Both the number of fringes and their contrast depend on the position of the trapping beam focal waist with respect to the sphere. The fringes are caused by diffraction that is due to the truncation of the tail of the trapping beam as the beam is transmitted through the sphere.

  8. The Brookhaven National Laboratory electron beam ion source for RHIC

    SciTech Connect (OSTI)

    Alessi, J.G.; Barton, D.; Beebe, E.; Bellavia, S.; Gould, O.; Kponou, A.; Lambiase, R.; Lockey, R.; McNerney, A.; Mapes, M.; Marneris, I.; Okamura, M.; Phillips, D.; Pikin, A.I.; Raparia, D.; Ritter, J.; Snydstrup, L.; Theisen, C.; Wilinski, M.

    2010-02-22

    As part of a new heavy ion preinjector that will supply beams for the Relativistic Heavy Ion Collider and the National Aeronautics and Space Administration Space Radiation Laboratory, construction of a new electron beam ion source (EBIS) is now being completed. This source, based on the successful prototype Brookhaven National Laboratory Test EBIS, is designed to produce milliampere level currents of all ion species, with q/m = (1/6)-(1/2). Among the major components of this source are a 5 T, 2-m-long, 204 mm diameter warm bore superconducting solenoid, an electron gun designed to operate at a nominal current of 10 A, and an electron collector designed to dissipate {approx} 300 kW of peak power. Careful attention has been paid to the design of the vacuum system, since a pressure of 10{sup -10} Torr is required in the trap region. The source includes several differential pumping stages, the trap can be baked to 400 C, and there are non-evaporable getter strips in the trap region. Power supplies include a 15 A, 15 kV electron collector power supply, and fast switchable power supplies for most of the 16 electrodes used for varying the trap potential distribution for ion injection, confinement, and extraction. The EBIS source and all EBIS power supplies sit on an isolated platform, which is pulsed up to a maximum of 100 kV during ion extraction. The EBIS is now fully assembled, and operation will be beginning following final vacuum and power supply tests. Details of the EBIS components are presented.

  9. Numerical simulation to study the transient self focusing of laser beam in plasma

    SciTech Connect (OSTI)

    Sharma, R. P.; Hussain, Saba Gaur, Nidhi

    2015-02-15

    In this paper, we present the numerical simulation for the coupled system of equations governing the dynamics of laser and Ion Acoustic Wave (IAW) in a collisionless plasma, when the coupling between the waves is through ponderomotive non-linearity. The nonlinear evolution of the laser beam is studied when the pump laser is perturbed by a periodic perturbation. By changing the perturbation wave number, we have studied its effect on the nonlinear evolution pattern of laser beam. In order to have a physical insight into the nonlinear dynamics of laser beam evolution in time and space, we have studied the laser and IAW spectra containing spatial harmonics. The magnitude of these harmonics changes with time and leads to time dependent localization of laser beam in spatial domain. The nonlinear dynamics of this localization is investigated in detail by using simulation and a semi-analytical model.

  10. Ponderomotive self-focusing of Gaussian laser beam in warm collisional plasma

    SciTech Connect (OSTI)

    Jafari Milani, M. R.; Niknam, A. R.; Farahbod, A. H.

    2014-06-15

    The propagation characteristics of a Gaussian laser beam through warm collisional plasma are investigated by considering the ponderomotive force nonlinearity and the complex eikonal function. By introducing the dielectric permittivity of warm unmagnetized plasma and using the WKB and paraxial ray approximations, the coupled differential equations defining the variations of laser beam parameters are obtained and solved numerically. Effects of laser and plasma parameters such as the collision frequency, the initial laser intensity and its spot size on the beam width parameter and the axis laser intensity distribution are analyzed. It is shown that, self-focusing of the laser beam takes place faster by increasing the collision frequency and initial laser spot size and then after some distance propagation the laser beam abruptly loses its initial diameter and vastly diverges. Furthermore, the modified electron density distribution is obtained and the collision frequency effect on this distribution is studied.

  11. The energy transfer in the TEMP-4M pulsed ion beam accelerator

    SciTech Connect (OSTI)

    Isakova, Y. I.; Pushkarev, A. I.; Khaylov, I. P.

    2013-07-15

    The results of a study of the energy transfer in the TEMP-4M pulsed ion beam accelerator are presented. The energy transfer efficiency in the Blumlein and a self-magnetically insulated ion diode was analyzed. Optimization of the design of the accelerator allows for 85% of energy transferred from Blumlein to the diode (including after-pulses), which indicates that the energy loss in Blumlein and spark gaps is insignificant and not exceeds 10%12%. Most losses occur in the diode. The efficiency of energy supplied to the diode to the energy of accelerated ions is 8%9% for a planar strip self-magnetic MID, 12%15% for focusing diode and 20% for a spiral self-magnetic MID.

  12. Interface and process for enhanced transmission of non-circular ion beams between stages at unequal pressure

    DOE Patents [OSTI]

    Tang, Keqi; Shvartsburg, Alexandre A.; Smith, Richard D.

    2008-03-04

    The invention discloses a new interface with non-circular conductance limit aperture(s) useful for effective transmission of non-circular ion beams between stages with different gas pressure. In particular, the invention provides an improved coupling of field asymmetric waveform ion mobility spectrometry (FAIMS) analyzers of planar or side-to-side geometry to downstream stages such as mass spectrometry or ion mobility spectrometry. In this case, the non-circular aperture is rectangular; other geometries may be optimum in other applications. In the preferred embodiment, the non-circular aperture interface is followed by an electrodynamic ion funnel that may focus wide ion beams of any shape into tight circular beams with virtually no losses. The jet disrupter element of the funnel may also have a non-circular geometry, matching the shape of arriving ion beam. The improved sensitivity of planar FAIMS/MS has been demonstrated in experiments using a non-contiguous elongated aperture but other embodiments (e.g., with a contiguous slit aperture) may be preferable, especially in conjunction with an ion funnel operated at high pressures.

  13. Ion beam analysis in cultural heritage studies: Milestones and perspectives

    SciTech Connect (OSTI)

    Dran, Jean-Claude; Calligaro, Thomas

    2013-07-18

    For three decades, ion beam analysis (IBA) in external mode was considered as the best choice for the characterisation of cultural heritage materials, as it combines excellent analytical performance and non-invasive character. However, in recent years, other analytical techniques arose as serious competitors, such as those based on synchrotron radiation (X-ray absorption, fluorescence or diffraction) or those using portable instruments (XRF, micro-Raman). It is shown that nevertheless IBA remains unmatched thanks to two unique features, namely the analysis of light elements and the high-resolution 3D chemical imaging.

  14. Inertial Fusion Driven by Intense Heavy-Ion Beams

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    INERTIAL FUSION DRIVEN BY INTENSE HEAVY-ION BEAMS * W. M. Sharp # , A. Friedman, D. P. Grote, J. J. Barnard, R. H. Cohen, M. A. Dorf, S. M. Lund, L. J. Perkins, M. R. Terry, LLNL, Livermore, CA, USA B. G. Logan, F. M. Bieniosek, A. Faltens, E. Henestroza, J.-Y. Jung, J. W. Kwan, E. P. Lee, S. M. Lidia, P. A. Ni, L. L. Reginato, P. K. Roy, P. A. Seidl, J. H. Takakuwa, J.-L. Vay, W. L. Waldron, LBNL, Berkeley, CA, USA R. C. Davidson, E. P. Gilson, I. D. Kaganovich, H. Qin, E. Startsev, PPPL,

  15. Self-focusing of profiled ultrashort-wavelength laser beams in air

    SciTech Connect (OSTI)

    Geints, Yu. E.; Zemlyanov, A. A.; Izyumov, N. A.; Ionin, A. A.; Kudryashov, S. I.; Seleznev, L. V. Sinitsyn, D. V.; Sunchugasheva, E. S.

    2013-02-15

    We report on the results of laboratory experiments of filamentation of sharply focused gigawatt femtosecond laser radiation passed through various aperture diaphragms in air. For the multiple filamentation regime, the dependences of the length and spatial structure of the filamentation region on the initial beam profile are established. It is found that light beam profiling by a diaphragm leads in some cases to a displacement of the filamentation region and to repeated self-focusing of radiation behind the linear focal waist. In the beam of the same power in the absence of a diaphragm and in the regime of the formation of a single filament, this effect terminates in front of the geometrical focus. The experimental results are illustrated by numerical simulation data.

  16. Production of intense negative hydrogen beams with polarized nuclei by selective neutralization of cold negative ions

    DOE Patents [OSTI]

    Hershcovitch, A.

    1984-02-13

    A process for selectively neutralizing H/sup -/ ions in a magnetic field to produce an intense negative hydrogen ion beam with spin polarized protons. Characteristic features of the process include providing a multi-ampere beam of H/sup -/ ions that are

  17. A CW radiofrequency ion source for production of negative hydrogen ion beams for cyclotrons

    SciTech Connect (OSTI)

    Kalvas, T.; Tarvainen, O.; Komppula, J.; Koivisto, H.; Tuunanen, J.; Potkins, D.; Stewart, T.; Dehnel, M. P.

    2015-04-08

    A CW 13.56 MHz radiofrequency-driven ion source RADIS for production of H{sup −} and D{sup −} beams is under development for replacing the filament-driven ion source of the MCC30/15 cyclotron. The RF ion source has a 16-pole multicusp plasma chamber, an electromagnet-based magnetic filter and an external planar spiral RF antenna behind an AlN window. The extraction is a 5-electrode system with an adjustable puller electrode voltage for optimizing the beam formation, a water-cooled electron dump electrode and an accelerating einzel lens. At 2650 W of RF power, the source produces 1 mA of H{sup −} (2.6 mA/cm{sup 2}), which is the intensity needed at injection for production of 200 µA H{sup +} with the filament-driven ion source. A simple pepperpot device has been developed for characterizing the beam emittance. Plans for improving the power efficiency with the use of a new permanent magnet front plate is discussed.

  18. Accessing defect dynamics using intense, nanosecond pulsed ion beams

    SciTech Connect (OSTI)

    Persaud, A.; Barnard, J. J.; Guo, H.; Hosemann, P.; Lidia, S.; Minor, A. M.; Seidl, P. A.; Schenkel, T.

    2015-06-18

    Gaining in-situ access to relaxation dynamics of radiation induced defects will lead to a better understanding of materials and is important for the verification of theoretical models and simulations. We show preliminary results from experiments at the new Neutralized Drift Compression Experiment (NDCX-II) at Lawrence Berkeley National Laboratory that will enable in-situ access to defect dynamics through pump-probe experiments. Here, the unique capabilities of the NDCX-II accelerator to generate intense, nanosecond pulsed ion beams are utilized. Preliminary data of channeling experiments using lithium and potassium ions and silicon membranes are shown. We compare these data to simulation results using Crystal Trim. Furthermore, we discuss the improvements to the accelerator to higher performance levels and the new diagnostics tools that are being incorporated.

  19. Accessing defect dynamics using intense, nanosecond pulsed ion beams

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Persaud, A.; Barnard, J. J.; Guo, H.; Hosemann, P.; Lidia, S.; Minor, A. M.; Seidl, P. A.; Schenkel, T.

    2015-06-18

    Gaining in-situ access to relaxation dynamics of radiation induced defects will lead to a better understanding of materials and is important for the verification of theoretical models and simulations. We show preliminary results from experiments at the new Neutralized Drift Compression Experiment (NDCX-II) at Lawrence Berkeley National Laboratory that will enable in-situ access to defect dynamics through pump-probe experiments. Here, the unique capabilities of the NDCX-II accelerator to generate intense, nanosecond pulsed ion beams are utilized. Preliminary data of channeling experiments using lithium and potassium ions and silicon membranes are shown. We compare these data to simulation results using Crystalmore » Trim. Furthermore, we discuss the improvements to the accelerator to higher performance levels and the new diagnostics tools that are being incorporated.« less

  20. Near equilibrium distributions for beams with space charge in linear and nonlinear periodic focusing systems

    SciTech Connect (OSTI)

    Sonnad, Kiran G.; Cary, John R.

    2015-04-15

    A procedure to obtain a near equilibrium phase space distribution function has been derived for beams with space charge effects in a generalized periodic focusing transport channel. The method utilizes the Lie transform perturbation theory to canonically transform to slowly oscillating phase space coordinates. The procedure results in transforming the periodic focusing system to a constant focusing one, where equilibrium distributions can be found. Transforming back to the original phase space coordinates yields an equilibrium distribution function corresponding to a constant focusing system along with perturbations resulting from the periodicity in the focusing. Examples used here include linear and nonlinear alternating gradient focusing systems. It is shown that the nonlinear focusing components can be chosen such that the system is close to integrability. The equilibrium distribution functions are numerically calculated, and their properties associated with the corresponding focusing system are discussed.

  1. Method and means of directing an ion beam onto an insulating surface for ion implantation or sputtering

    DOE Patents [OSTI]

    Gruen, Dieter M.; Krauss, Alan R.; Siskind, Barry

    1981-01-01

    A beam of ions is directed under control onto an insulating surface by supplying simultaneously a stream of electrons directed at the same surface in a quantity sufficient to neutralize the overall electric charge of the ion beam and result in a net zero current flow to the insulating surface. The ion beam is adapted particularly both to the implantation of ions in a uniform areal disposition over the insulating surface and to the sputtering of atoms or molecules of the insulator onto a substrate.

  2. Production of intense negative hydrogen beams with polarized nuclei by selective neutralization of negative ions

    DOE Patents [OSTI]

    Hershcovitch, Ady

    1987-01-01

    A process for selectively neutralizing H.sup.- ions in a magnetic field to produce an intense negative hydrogen ion beam with spin polarized protons. Characteristic features of the process include providing a multi-ampere beam of H.sup.- ions that are intersected by a beam of laser light. Photodetachment is effected in a uniform magnetic field that is provided around the beam of H.sup.- ions to spin polarize the H.sup.- ions and produce first and second populations or groups of ions, having their respective proton spin aligned either with the magnetic field or opposite to it. The intersecting beam of laser light is directed to selectively neutralize a majority of the ions in only one population, or given spin polarized group of H.sup.- ions, without neutralizing the ions in the other group thereby forming a population of H.sup.- ions each of which has its proton spin down, and a second group or population of H.sup.o atoms having proton spin up. Finally, the two groups of ions are separated from each other by magnetically bending the group of H.sup.- ions away from the group of neutralized ions, thereby to form an intense H.sup.- ion beam that is directed toward a predetermined objective.

  3. Proton Acceleration: New Developments in Energy Increase, Focusing...

    Office of Scientific and Technical Information (OSTI)

    ... Country of Publication: United States Language: English Subject: 43 PARTICLE ACCELERATORS; ACCELERATION; ACCELERATORS; BRIGHTNESS; FOCUSING; ION BEAMS; ION SOURCES; LASERS; PLASMA; ...

  4. THE DISPERSION RELATIONS AND INSTABILITY THRESHOLDS OF OBLIQUE PLASMA MODES IN THE PRESENCE OF AN ION BEAM

    SciTech Connect (OSTI)

    Verscharen, Daniel; Chandran, Benjamin D. G. E-mail: benjamin.chandran@unh.edu

    2013-02-10

    An ion beam can destabilize Alfven/ion-cyclotron waves and magnetosonic/whistler waves if the beam speed is sufficiently large. Numerical solutions of the hot-plasma dispersion relation have previously shown that the minimum beam speed required to excite such instabilities is significantly smaller for oblique modes with k Multiplication-Sign B {sub 0} {ne} 0 than for parallel-propagating modes with k Multiplication-Sign B {sub 0} = 0, where k is the wavevector and B {sub 0} is the background magnetic field. In this paper, we explain this difference within the framework of quasilinear theory, focusing on low-{beta} plasmas. We begin by deriving, in the cold-plasma approximation, the dispersion relation and polarization properties of both oblique and parallel-propagating waves in the presence of an ion beam. We then show how the instability thresholds of the different wave branches can be deduced from the wave-particle resonance condition, the conservation of particle energy in the wave frame, the sign (positive or negative) of the wave energy, and the wave polarization. We also provide a graphical description of the different conditions under which Landau resonance and cyclotron resonance destabilize Alfven/ion-cyclotron waves in the presence of an ion beam. We draw upon our results to discuss the types of instabilities that may limit the differential flow of alpha particles in the solar wind.

  5. Acceleration and stability of a high-current ion beam in induction fields

    SciTech Connect (OSTI)

    Karas', V. I.; Manuilenko, O. V.; Tarakanov, V. P.; Federovskaya, O. V.

    2013-03-15

    A one-dimensional nonlinear analytic theory of the filamentation instability of a high-current ion beam is formulated. The results of 2.5-dimensional numerical particle-in-cell simulations of acceleration and stability of an annular compensated ion beam (CIB) in a linear induction particle accelerator are presented. It is shown that additional transverse injection of electron beams in magnetically insulated gaps (cusps) improves the quality of the ion-beam distribution function and provides uniform beam acceleration along the accelerator. The CIB filamentation instability in both the presence and the absence of an external magnetic field is considered.

  6. Determination of ion track radii in amorphous matrices via formation of nano-clusters by ion-beam irradiation

    SciTech Connect (OSTI)

    Buljan, M.; Karlusic, M.; Bogdanovic-Radovic, I.; Jaksic, M.; Radic, N.; Salamon, K.; Bernstorff, S.

    2012-09-03

    We report on a method for the determination of ion track radii, formed in amorphous materials by ion-beam irradiation. The method is based on the addition to an amorphous matrix of a small amount of foreign atoms, which easily diffuse and form clusters when the temperature is sufficiently increased. The irradiation causes clustering of these atoms, and the final separations of the formed clusters are dependent on the parameters of the ion-beam. Comparison of the separations between the clusters that are formed by ions with different properties in the same type of material enables the determination of ion-track radii.

  7. Production, formation, and transport of high-brightness atomic hydrogen beam studies for the relativistic heavy ion collider polarized source upgrade

    SciTech Connect (OSTI)

    Kolmogorov, A. Stupishin, N.; Atoian, G.; Ritter, J.; Zelenski, A.; Davydenko, V.; Ivanov, A.; Novosibirsk State University, Novosibirsk

    2014-02-15

    The RHIC polarized H{sup ?} ion source had been successfully upgraded to higher intensity and polarization by using a very high brightness fast atomic beam source developed at BINP, Novosibirsk. In this source the proton beam is extracted by a four-grid multi-aperture ion optical system and neutralized in the H{sub 2} gas cell downstream from the grids. The proton beam is extracted from plasma emitter with a low transverse ion temperature of ?0.2 eV which is formed by plasma jet expansion from the arc plasma generator. The multi-hole grids are spherically shaped to produce geometrical beam focusing. Proton beam formation and transport of atomic beam were experimentally studied at test bench.

  8. Direct Drive Heavy-Ion-Beam Inertial Fusion at High Coupling Efficiency

    SciTech Connect (OSTI)

    Logan, B. Grant; Logan, B. Grant; Perkins, L.J.; Barnard, J.J.

    2007-06-25

    Issues with coupling efficiency, beam illumination symmetry and Rayleigh Taylor (RT) instability are discussed for spherical heavy-ion-beam-driven targets with and without hohlraums. Efficient coupling of heavy ion beams to compress direct-drive inertial fusion targets without hohlraums is found to require ion range increasing several-fold during the drive pulse. One-dimensional implosion calculations using the LASNEX ICF target physics code shows the ion range increasing four-fold during the drive pulse to keep ion energy deposition following closely behind the imploding ablation front, resulting in high coupling efficiencies (shell kinetic energy/incident beam energy of 16 to 18%). Ways to increase beam ion range while mitigating Rayleigh-Taylor instabilities are discussed for future work.

  9. Test bench to commission a third ion source beam line and a newly designed extraction system

    SciTech Connect (OSTI)

    Winkelmann, T.; Cee, R.; Haberer, T.; Naas, B.; Peters, A.

    2012-02-15

    The HIT (Heidelberg Ion Beam Therapy Center) is the first hospital-based treatment facility in Europe where patients can be irradiated with protons and carbon ions. Since the commissioning starting in 2006 two 14.5 GHz electron cyclotron resonance ion sources are routinely used to produce a variety of ion beams from protons up to oxygen. In the future a helium beam for regular patient treatment is requested, therefore a third ion source (Supernanogan source from PANTECHNIK S.A.) will be integrated. This third ECR source with a newly designed extraction system and a spectrometer line is installed at a test bench at HIT to commission and validate this section. Measurements with different extraction system setups will be presented to show the improvement of beam quality for helium, proton, and carbon beams. An outlook to the possible integration scheme of the new ion source into the production facility will be discussed.

  10. Generation and focusing of electron beams with initial transverse-longitudinal correlation

    SciTech Connect (OSTI)

    Harris, J. R.; Lewellen, J. W.; Poole, B. R.

    2014-10-07

    In charged particle beams, one of the roles played by space charge is to couple the transverse and longitudinal dynamics of the beam. This can lead to very complex phenomena which are generally studied using computer simulations. However, in some cases models based on phenomenological or analytic approximations can provide valuable insight into the system behavior. In this paper, we employ such approximations to investigate the conditions under which all the slices of a space charge dominated electron beam with slowly varying current could be focused to a waist with the same radius and at the same location, independent of slice current, and show that this can be accomplished approximately if the initial transverse-longitudinal correlation introduced onto the beam by the electron gun is chosen to compensate for the transverse-longitudinal correlation introduced onto the beam in the drift section. The validity of our approximations is assessed by use of progressively more realistic calculations. We also consider several design elements of electron guns that affect the initial correlations in the beams they generate.