National Library of Energy BETA

Sample records for drapes reflective film

  1. Method of making reflecting film reflector

    DOE Patents [OSTI]

    Cottingham, James G.

    1980-01-01

    A reflector of the reflecting film type is disclosed and which may be used in a heliostatic system for concentrating solar energy and comprising a reflecting film bonded to an appropriate rigid substrate in such a way that specularity of a very high order is achieved. A method of bonding the reflecting film to the substrate is also disclosed and comprises the steps of initially adhering the film to a smooth, clean flat rigid surface with a non-bonding liquid between the rigid surface and film, and then bonding the substrate and film. The non-bonding liquid has a molecular adhesion greater than any stresses due to handling or curing of the bonding agent which is applied between the film and the opposing surface of the rigid substrate.

  2. Glue Film Thickness Measurements by Spectral Reflectance

    SciTech Connect (OSTI)

    B. R. Marshall

    2010-09-20

    Spectral reflectance was used to determine the thickness of thin glue layers in a study of the effect of the glue on radiance and reflectance measurements of shocked-tin substrates attached to lithium fluoride windows. Measurements based on profilometry of the components were found to be inaccurate due to flatness variations and deformation of the tin substrate under pressure during the gluing process. The accuracy of the spectral reflectance measurements were estimated to be ±0.5 μm, which was sufficient to demonstrate a convincing correlation between glue thickness and shock-generated light.

  3. Ultrafast transient reflectance of epitaxial semiconducting perovskite thin films

    SciTech Connect (OSTI)

    Smolin, S. Y.; Guglietta, G. W.; Baxter, J. B. E-mail: smay@coe.drexel.edu; Scafetta, M. D.; May, S. J. E-mail: smay@coe.drexel.edu

    2014-07-14

    Ultrafast pump-probe transient reflectance (TR) spectroscopy was used to study carrier dynamics in an epitaxial perovskite oxide thin film of LaFeO{sub 3} (LFO) with a thickness of 40 unit cells (16?nm) grown by molecular beam epitaxy on (LaAlO{sub 3}){sub 0.3}(Sr{sub 2}AlTaO{sub 6}){sub 0.7} (LSAT). TR spectroscopy shows two negative transients in reflectance with local maxima at ?2.5?eV and ?3.5?eV which correspond to two optical transitions in LFO as determined by ellipsometry. The kinetics at these transients were best fit with an exponential decay model with fast (540 ps), medium (?200 ps), and slow (??3?ns) components that we attribute mainly to recombination of photoexcited carriers. Moreover, these reflectance transients did not completely decay within the observable time window, indicating that ?10% of photoexcited carriers exist for at least 3?ns. This work illustrates that TR spectroscopy can be performed on thin (<20?nm) epitaxial oxide films to provide a quantitative understanding of recombination lifetimes, which are important parameters for the potential utilization of perovskite films in photovoltaic and photocatalytic applications.

  4. On-Line Measurement of Lubricant Film Thickness Using Ultrasonic Reflection Coefficients

    SciTech Connect (OSTI)

    Drinkwater, B.W.; Dwyer-Joyce, R.S.; Harper, P.

    2004-02-26

    The ultrasonic reflectivity of a lubricant layer between two solid bodies depends on the ultrasonic frequency, the acoustic properties of the liquid and solid, and the layer thickness. In this paper, ultrasonic reflectivity measurements are used as a method for determining the thickness of lubricating films in bearing systems. An ultrasonic transducer is positioned on the outside of a bearing shell such that the wave is focused on the lubricant film layer. For a particular lubricant film the reflected pulse is processed to give a reflection coefficient spectrum. The lubricant film thickness is then obtained from either the layer stiffness or the resonant frequency. The method has been validated using static fluid wedges and the elastohydrodynamic film formed between a ball sliding on a flat. Film thickness values in the range 50-500 nm were recorded which agreed well with theoretical film formation predictions.

  5. Molecular orientation in soft matter thin films studied by resonant soft x-ray reflectivity

    SciTech Connect (OSTI)

    Mezger, Markus; Jerome, Blandine; Kortright, Jeffrey B; Valvidares, Manuel; Gullikson, Eric M; Giglia, Angelo; Mahne, Nicola; Nannarone, Stefano

    2011-04-05

    We present a technique to study depth profiles of molecular orientation in soft matter thin films with nanometer resolution. The method is based on dichroism in resonant soft x-ray reflectivity using linear s and p polarization. It combines the chemical sensitivity of near-edge x-ray absorption fine structure spectroscopy to specific molecular bonds and their orientation relative to the polarization of the incident beam with the precise depth profiling capability of x-ray reflectivity. We demonstrate these capabilities on side chain liquid crystalline polymer thin films with soft x-ray reflectivity data at the carbon K edge. Optical constants of the anisotropic refractive index ellipsoid were obtained from a quantitative analysis using the Berreman formalism. For films up to 50 nm thickness we find that the degree of orientation of the long axis exhibits no depth variation and is independent of the film thickness.

  6. Molecular orientation in soft matter thin films studied by resonant soft X-ray reflectivity

    SciTech Connect (OSTI)

    Mezger, Markus; Jerome, Blandine; Kortright, Jeffrey B.; Valvidares, Manuel; Gullikson, Eric; Giglia, Angelo; Mahne, Nicola; Nannarone, Stefano

    2011-01-12

    We present a technique to study depth profiles of molecular orientation in soft matter thin films with nanometer resolution. The method is based on dichroism in resonant soft X-ray reflectivity using linear s- and p-polarization. It combines the chemical sensitivity of Near-Edge X-ray Absorption Fine Structure spectroscopy to specific molecular bonds and their orientation relative to the polarization of the incident beam with the precise depth profiling capability of X-ray reflectivity. We demonstrate these capabilities on side chain liquid crystalline polymer thin films with soft X-ray reflectivity data at the carbon K edge. Optical constants of the anisotropic refractive index ellipsoid were obtained from a quantitative analysis using the Berreman formalism. For films up to 50 nm thickness we find that the degree of orientation of the long axis exhibits no depth variation and isindependent of the film thickness.

  7. A protocol for EBT3 radiochromic film dosimetry using reflection scanning

    SciTech Connect (OSTI)

    Papaconstadopoulos, Pavlos Hegyi, Gyorgy; Seuntjens, Jan; Devic, Slobodan

    2014-12-15

    Purpose: To evaluate the performance of the EBT3 radiochromic film dosimetry system using reflection measurements and to suggest a calibration protocol for precise and accurate reflection film dosimetry. Methods: A set of 14 Gafchromic EBT3 film pieces were irradiated to various doses ranging from 0 to 8 Gy and subsequently scanned using both the reflection and transmission mode. Scanning resolution varied from 50 to 508 dpi (0.50.05 mm/pixel). Both the red and green color channels of scanned images were used to relate the film response to the dose. A sensitivity, uncertainty, and accuracy analysis was performed for all scanning modes and color channels. The total uncertainty, along with the fitting and experimental uncertainty components, was identified and analyzed. A microscope resolution target was used to evaluate possible resolution losses under reflection scanning. The calibration range was optimized for reflection scanning in the low (<2 Gy) and high (>2 Gy) dose regions based on the reported results. Results: Reflection scanning using the red channel exhibited the highest sensitivity among all modes, being up to 150% higher than transmission mode in the red channel for the lowest dose level. Furthermore, there was no apparent loss in resolution between the two modes. However, higher uncertainties and reduced accuracy were observed for the red channel under reflection mode, especially at dose levels higher than 2 Gy. These uncertainties were mainly attributed to saturation effects which were translated in poor fitting results. By restricting the calibration to the 02 Gy dose range, the situation is reversed and the red reflection mode was superior to the transmission mode. For higher doses, the green channel in reflection mode presented comparable results to the red transmission. Conclusions: A two-color reflection scanning protocol can be suggested for EBT3 radiochromic film dosimetry using the red channel for doses less than 2 Gy and the green channel for higher doses. The precision and accuracy are significantly improved in the low dose region following such a protocol.

  8. Development of Abrasion-Resistant Coating for Solar Reflective Films. Cooperative Research and Development Final Report, CRADA Number CRD-07-247

    SciTech Connect (OSTI)

    Gray, Matthew

    2015-10-01

    The purpose of this CRADA is to develop an abrasion-resistant coating, suitable for use on polymeric-based reflective films (e.g., the ReflecTech reflective film), that allows for improved scratch resistance and enables the use of aggressive cleaning techniques (e.g., direct contact methods like brushing) without damaging the specular reflectance properties of the reflective film.

  9. Fluorine-containing composition for forming anti-reflection film on resist surface and pattern formation method

    DOE Patents [OSTI]

    Nishi, Mineo; Makishima, Hideo

    1996-01-01

    A composition for forming anti-reflection film on resist surface which comprises an aqueous solution of a water soluble fluorine compound, and a pattern formation method which comprises the steps of coating a photoresist composition on a substrate; coating the above-mentioned composition for forming anti-reflection film; exposing the coated film to form a specific pattern; and developing the photoresist, are provided. Since the composition for forming anti-reflection film can be coated on the photoresist in the form of an aqueous solution, not only the anti-reflection film can be formed easily, but also, the film can be removed easily by rinsing with water or alkali development. Therefore, by the pattern formation method according to the present invention, it is possible to form a pattern easily with a high dimensional accuracy.

  10. Vitrified chiral-nematic liquid crystalline films for selective reflection and circular polarization

    SciTech Connect (OSTI)

    Katsis, D.; Chen, P.H.M.; Mastrangelo, J.C.; Chen, S.H.; Blanton, T.N.

    1999-06-01

    Nematic and left-handed chiral-nematic liquid crystals comprising methoxybiphenylbenzoate and (S)-(-)-1-phenylethylamine pendants to a cyclohexane core were synthesized and characterized. Although pristine samples were found to be polycrystalline, thermal quenching following heating to and annealing at elevated temperatures permitted the molecular orders characteristic of liquid crystalline mesomorphism to be frozen in the glassy state. Left at room temperature for 6 months, the vitrified liquid crystalline films showed no evidence of recrystallization. An orientational order parameter of 0.65 was determined with linear dichroism of a vitrified nematic film doped with Exalite 428 at a mole fraction of 0.0025. Birefringence dispersion of a blank vitrified nematic film was determined using a phase-difference method complemented by Abbe refractometry. A series of vitrified chiral-nematic films were prepared to demonstrate selective reflection and circular polarization with a spectral region tunable from blue to the infrared region by varying the chemical composition. The experimentally measured circular polarization spectra were found to agree with the Good-Karali theory in which all four system parameters were determined a priori: optical birefringence, average refractive index, selective reflection wavelength, and film thickness.

  11. Thin film transistors on plastic substrates with reflective coatings for radiation protection

    DOE Patents [OSTI]

    Wolfe, Jesse D.; Theiss, Steven D.; Carey, Paul G.; Smith, Patrick M.; Wickbold, Paul

    2006-09-26

    Fabrication of silicon thin film transistors (TFT) on low-temperature plastic substrates using a reflective coating so that inexpensive plastic substrates may be used in place of standard glass, quartz, and silicon wafer-based substrates. The TFT can be used in large area low cost electronics, such as flat panel displays and portable electronics such as video cameras, personal digital assistants, and cell phones.

  12. Thin film transistors on plastic substrates with reflective coatings for radiation protection

    DOE Patents [OSTI]

    Wolfe, Jesse D.; Theiss, Steven D.; Carey, Paul G.; Smith, Patrick M.; Wickboldt, Paul

    2003-11-04

    Fabrication of silicon thin film transistors (TFT) on low-temperature plastic substrates using a reflective coating so that inexpensive plastic substrates may be used in place of standard glass, quartz, and silicon wafer-based substrates. The TFT can be used in large area low cost electronics, such as flat panel displays and portable electronics such as video cameras, personal digital assistants, and cell phones.

  13. Near IR Scanning Angle Total Internal Reflection Raman Spectroscopy at Smooth Gold Films

    SciTech Connect (OSTI)

    McKee, Kristopher; Meyer, Matthew; Smith, Emily

    2012-04-13

    Total internal reflection (TIR) Raman and reflectivity spectra were collected for nonresonant analytes as a function of incident angle at sapphire or sapphire/smooth 50 nm gold interfaces using 785 nm excitation. For both interfaces, the Raman signal as a function of incident angle is well-modeled by the calculated interfacial mean square electric field (MSEF) relative to the incident field times the thickness of the layer being probed in the Raman measurement (D{sub RS}). The Raman scatter was reproducibly enhanced at the interface containing a gold film relative to the sapphire interface by a factor of 4.34.6 for aqueous pyridine or 2.23.7 for neat nitrobenzene, depending on the analyzed vibrational mode. The mechanism for the increased Raman signal is the enhanced MSEF at incident angles where propagating surface plasmons are excited in the metal film. The background from the TIR prism was reduced by 8995% with the addition of the gold film, and the percent relative uncertainty in peak area was reduced from 15 to 1.7% for the 1347 cm1 mode of nitrobenzene. Single monolayers of benzenethiol (S/N = 6.8) and 4-mercaptopyridine (S/N = 16.5) on gold films were measured by TIR Raman spectroscopy with 785 nm excitation (210 mW) without resonant enhancement in 1 min.

  14. A New Stochastic Modeling of 3-D Mud Drapes Inside Point Bar Sands in Meandering River Deposits

    SciTech Connect (OSTI)

    Yin, Yanshu

    2013-12-15

    The environment of major sediments of eastern China oilfields is a meandering river where mud drapes inside point bar sand occur and are recognized as important factors for underground fluid flow and distribution of the remaining oil. The present detailed architectural analysis, and the related mud drapes' modeling inside a point bar, is practical work to enhance oil recovery. This paper illustrates a new stochastic modeling of mud drapes inside point bars. The method is a hierarchical strategy and composed of three nested steps. Firstly, the model of meandering channel bodies is established using the Fluvsim method. Each channel centerline obtained from the Fluvsim is preserved for the next simulation. Secondly, the curvature ratios of each meandering river at various positions are calculated to determine the occurrence of each point bar. The abandoned channel is used to characterize the geometry of each defined point bar. Finally, mud drapes inside each point bar are predicted through random sampling of various parameters, such as number, horizontal intervals, dip angle, and extended distance of mud drapes. A dataset, collected from a reservoir in the Shengli oilfield of China, was used to illustrate the mud drapes' building procedure proposed in this paper. The results show that the inner architectural elements of the meandering river are depicted fairly well in the model. More importantly, the high prediction precision from the cross validation of five drilled wells shows the practical value and significance of the proposed method.

  15. Reflection High-Energy Electron Diffraction Beam-Induced Structural and Property Changes on WO3 Thin Films

    SciTech Connect (OSTI)

    Du, Yingge; Zhang, Hongliang; Varga, Tamas; Chambers, Scott A.

    2014-08-08

    Reduction of transition metal oxides can greatly change their physical and chemical properties. Using deposition of WO3 as a case study, we demonstrate that reflection high-energy electron diffraction (RHEED), a surface-sensitive tool widely used to monitor thin-film deposition processes, can significantly affect the cation valence and physical properties of the films through electron-beam induced sample reduction. The RHEED beam is found to increase film smoothness during epitaxial growth of WO3, as well as change the electronic properties of the film through preferential removal of surface oxygen.

  16. Reflection high-energy electron diffraction beam-induced structural and property changes on WO{sub 3} thin films

    SciTech Connect (OSTI)

    Du, Y. Varga, T.; Zhang, K. H. L.; Chambers, S. A.

    2014-08-04

    Reduction of transition metal oxides can greatly change their physical and chemical properties. Using deposition of WO{sub 3} as a case study, we demonstrate that reflection high-energy electron diffraction (RHEED), a surface-sensitive tool widely used to monitor thin-film deposition processes, can significantly affect the cation valence and physical properties of the films through electron-beam induced sample reduction. The RHEED beam is found to increase film smoothness during epitaxial growth of WO{sub 3}, as well as change the electronic properties of the film through preferential removal of surface oxygen.

  17. Elucidation of Perovskite Film Micro-Orientations Using Two-Photon Total Internal Reflectance Fluorescence Microscopy

    SciTech Connect (OSTI)

    Watson, Brianna R; Yang, Bin; Xiao, Kai; Ma, Yingzhong; Doughty, Benjamin L; Calhoun, Tessa R

    2015-01-01

    The emergence of efficient hybrid organic-inorganic perovskite photovoltaic materials has caused the rapid development of a variety of preparation and processing techniques designed to maximize their performance. As processing methods continue to emerge, it is important to understand how the optical properties of these materials are affected on a microscopic scale. Here polarization resolved two-photon total internal reflectance microscopy (TIRFM) was used to probe changes in transition dipole moment orientation as a function of thermal annealing time in hybrid organic-inorganic lead iodide based perovskite (CH3NH3PbI3) thin films on glass. These results show that as thermal annealing time is increased the distribution of transition moments pointing out-of-plane decreases in favor of forming areas with increased in-plane orientations. It was also shown through the axial sensitivity of TIRFM that the surface topography is manifested in the signal intensity and can be used to survey aspects of morphology in coincidence with the optical properties of these films.

  18. Elucidation of perovskite film micro-orientations using two-photon total internal reflectance fluorescence microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Watson, Brianna R.; Yang, Bin; Xiao, Kai; Ma, Ying -Zhong; Doughty, Benjamin L.; Calhoun, Tessa R.

    2015-07-29

    The emergence of efficient hybrid organic-inorganic perovskite photovoltaic materials has caused the rapid development of a variety of preparation and processing techniques designed to maximize their performance. As processing methods continue to emerge, it is important to understand how the optical properties of these materials are affected on a microscopic scale. Here polarization resolved two-photon total internal reflectance microscopy (TIRFM) was used to probe changes in transition dipole moment orientation as a function of thermal annealing time in hybrid organic-inorganic lead iodide based perovskite (CH3NH3PbI3) thin films on glass. These results show that as thermal annealing time is increased themore » distribution of transition moments pointing out-of-plane decreases in favor of forming areas with increased in-plane orientations. As a result, it was also shown through the axial sensitivity of TIRFM that the surface topography is manifested in the signal intensity and can be used to survey aspects of morphology in coincidence with the optical properties of these films.« less

  19. Growth kinetics and compositional analysis of silicon rich a-SiN{sub x}:H film: A soft x-ray reflectivity study

    SciTech Connect (OSTI)

    Singh, Sarab Preet; Srivastava, P.; Modi, Mohammed H.

    2010-10-11

    We report soft x-ray reflectivity measurements near the Si L{sub 2,3} absorption edge for Si-rich silicon nitride thin film obtained by Hg-sensitized photochemical vapor deposition. We demonstrate that the precise analysis of optical index profile derived over extended energy region gives compositional details of the film. This nondestructive approach is used in Si-rich silicon nitride film to reveal buried Si-rich interfacial layer. Further, the combined study of soft x-ray reflectivity and optical density obtained from the reflectivity fitting at various photon energies provide a qualitative estimation of the film composition and its growth.

  20. Use of double-layer ITO films in reflective contacts for blue and near-UV LEDs

    SciTech Connect (OSTI)

    Markov, L. K., E-mail: l.markov@mail.ioffe.ru; Smirnova, I. P.; Pavluchenko, A. S. [Russian Academy of Sciences, Ioffe Physical-Technical Institute (Russian Federation); Kukushkin, M. V. [ZAO Innovation Company TETIS (Russian Federation); Zakheim, D. A.; Pavlov, S. I. [Russian Academy of Sciences, Ioffe Physical-Technical Institute (Russian Federation)

    2014-12-15

    The structural and optical properties of multilayer ITO/SiO{sub 2}/Ag composites are studied. In these composites, the ITO (indium-tin oxide) layer is produced by two different methods: electron-beam evaporation and a combined method including electron-beam evaporation and subsequent magnetron sputtering. It is shown that the reflectance of the composite based on the ITO film produced by electron-beam evaporation is substantially lower. This can be attributed to the strong absorption of light at both boundaries of the SiO{sub 2} layer, which results from the complex surface profile of ITO films deposited by electron-beam evaporation. Samples with a film deposited by the combined method have a reflectance of about 90% at normal light incidence, which, combined with their higher electrical conductivity, makes these samples advantageous for use as reflective contacts to the p-type region of AlInGaN light-emitting diodes of the flip-chip design.

  1. Reflection-Absorption Infrared Spectroscopy of Thin Films Using an External Cavity Quantum Cascade Laser

    SciTech Connect (OSTI)

    Phillips, Mark C.; Craig, Ian M.; Blake, Thomas A.

    2013-02-04

    We present experimental demonstrations using a broadly tunable external cavity quantum cascade laser (ECQCL) to perform Reflection-Absorption InfraRed Spectroscopy (RAIRS) of thin layers and residues on surfaces. The ECQCL compliance voltage was used to measure fluctuations in the ECQCL output power and improve the performance of the RAIRS measurements. Absorption spectra from self-assembled monolayers of a fluorinated alkane thiol and a thiol carboxylic acid were measured and compared with FTIR measurements. RAIRS spectra of the explosive compounds PETN, RDX, and tetryl deposited on gold substrates were also measured. Rapid measurement times and low noise were demonstrated, with < 1E-3 absorbance noise for a 10 second measurement time.

  2. Measuring the structure of thin soft matter films under confinement: A surface-force type apparatus for neutron reflection, based on a flexible membrane approach

    SciTech Connect (OSTI)

    Vos, Wiebe M. de; Mears, Laura L. E.; Richardson, Robert M.; Cosgrove, Terence; Prescott, Stuart W.; Dalgliesh, Robert M.

    2012-11-15

    A unique surface force type apparatus that allows the investigation of a confined thin film using neutron reflection is described. The central feature of the setup consists of a solid substrate (silicon) and a flexible polymer membrane (Melinex{sup Registered-Sign }). We show that inflation of the membrane against the solid surface provides close and even contact between the interfaces over a large surface area. Both heavy water and air can be completely squeezed out from between the flexible film and the solid substrate, leaving them in molecular contact. The strength of confinement is controlled by the pressure used to inflate the membrane. Dust provides a small problem for this approach as it can get trapped between membrane and substrate to prevent a small part of the membrane from making good contact with the substrate. This results in the measured neutron reflectivity containing a small component of an unwanted reflection, between 10% and 20% at low confining pressures (1 bar) and between 1% and 5% at high confining pressures (5 bar). However, we show that this extra signal does not prevent good and clear information on the structure of thin films being extracted from the neutron reflectivity. The effects of confinement are illustrated with data from a poly(vinyl pyrollidone) gel layer in water, a polyelectrolyte multilayer in water, and with data from a stack of supported lipid-bilayers swollen with D{sub 2}O vapor. The data demonstrates the potential of this apparatus to provide information on the structure of thin films under confinement for a known confining pressure.

  3. Total reflection inelastic x-ray scattering from a 10 nm thick La{sub 0.6}Sr{sub 0.2}CoO{sub 3} thin film.

    SciTech Connect (OSTI)

    Fister, T. T.; Fong, D. D.; Eastman, J. A.; Iddir, H.; Zapol, P.; Fuoss, P. H.; Balasubramanian, M.; Gordon, R. A.; Balasubramaniam, K. R.; Salvador, P. A.; Simon Fraser Univ.; Carnegie Mellon Univ.

    2011-01-18

    To study equilibrium changes in composition, valence, and electronic structure near the surface and into the bulk, we demonstrate the use of a new approach, total-reflection inelastic x-ray scattering, as a sub-keV spectroscopy capable of depth profiling chemical changes in thin films with nanometer resolution. By comparing data acquired under total x-ray reflection and penetrating conditions, we are able to separate the O K-edge spectra from a 10 nm La{sub 0.6}Sr{sub 0.4}CoO{sub 3} thin film from that of the underlying SrTiO{sub 3} substrate. With a smaller wavelength probe than comparable soft x-ray absorption measurements, we also describe the ability to easily access dipole-forbidden final states, using the dramatic evolution of the La N{sub 4,5} edge with momentum transfer as an example.

  4. Variable area light reflecting assembly

    DOE Patents [OSTI]

    Howard, T.C.

    1986-12-23

    Device is described for tracking daylight and projecting it into a building. The device tracks the sun and automatically adjusts both the orientation and area of the reflecting surface. The device may be mounted in either a wall or roof of a building. Additionally, multiple devices may be employed in a light shaft in a building, providing daylight to several different floors. The preferred embodiment employs a thin reflective film as the reflecting device. One edge of the reflective film is fixed, and the opposite end is attached to a spring-loaded take-up roller. As the sun moves across the sky, the take-up roller automatically adjusts the angle and surface area of the film. Additionally, louvers may be mounted at the light entrance to the device to reflect incoming daylight in an angle perpendicular to the device to provide maximum reflective capability when daylight enters the device at non-perpendicular angles. 9 figs.

  5. Variable area light reflecting assembly

    DOE Patents [OSTI]

    Howard, Thomas C.

    1986-01-01

    Device for tracking daylight and projecting it into a building. The device tracks the sun and automatically adjusts both the orientation and area of the reflecting surface. The device may be mounted in either a wall or roof of a building. Additionally, multiple devices may be employed in a light shaft in a building, providing daylight to several different floors. The preferred embodiment employs a thin reflective film as the reflecting device. One edge of the reflective film is fixed, and the opposite end is attached to a spring-loaded take-up roller. As the sun moves across the sky, the take-up roller automatically adjusts the angle and surface area of the film. Additionally, louvers may be mounted at the light entrance to the device to reflect incoming daylight in an angle perpendicular to the device to provide maximum reflective capability when daylight enters the device at non-perpendicular angles.

  6. REFLECT HOME

    Broader source: Energy.gov [DOE]

    Sacramento is nicknamed the City of Trees, so it made sense for the California State University, Sacramento, team to showcase nature in its Solar Decathlon 2015 project. The team’s Reflect Home does just that by embracing the city’s sense of expansive greenery.

  7. Save Money with Your Very Own Drapes

    Broader source: Energy.gov [DOE]

    So, last winter I decided that I was going to get crafty and make my own blankets as an incentive to keep the thermostat low. It was a fun project, and it actually worked. I needed more blankets,...

  8. Thin-film optical initiator

    DOE Patents [OSTI]

    Erickson, Kenneth L.

    2001-01-01

    A thin-film optical initiator having an inert, transparent substrate, a reactive thin film, which can be either an explosive or a pyrotechnic, and a reflective thin film. The resultant thin-film optical initiator system also comprises a fiber-optic cable connected to a low-energy laser source, an output charge, and an initiator housing. The reactive thin film, which may contain very thin embedded layers or be a co-deposit of a light-absorbing material such as carbon, absorbs the incident laser light, is volumetrically heated, and explodes against the output charge, imparting about 5 to 20 times more energy than in the incident laser pulse.

  9. Process to form mesostructured films

    DOE Patents [OSTI]

    Brinker, C. Jeffrey; Anderson, Mark T.; Ganguli, Rahul; Lu, Yunfeng

    1999-01-01

    This invention comprises a method to form a family of supported films film with pore size in the approximate range 0.8-20 nm exhibiting highly ordered microstructures and porosity derived from an ordered micellar or liquid-crystalline organic-inorganic precursor structure that forms during film deposition. Optically transparent, 100-500-nm thick films exhibiting a unique range of microstructures and uni-modal pore sizes are formed in seconds in a continuous coating operation. Applications of these films include sensors, membranes, low dielectric constant interlayers, anti-reflective coatings, and optical hosts.

  10. Annealed CVD molybdenum thin film surface

    DOE Patents [OSTI]

    Carver, Gary E. (Tucson, AZ); Seraphin, Bernhard O. (Tucson, AZ)

    1984-01-01

    Molybdenum thin films deposited by pyrolytic decomposition of Mo(CO).sub.6 attain, after anneal in a reducing atmosphere at temperatures greater than 700.degree. C., infrared reflectance values greater than reflectance of supersmooth bulk molybdenum. Black molybdenum films deposited under oxidizing conditions and annealed, when covered with an anti-reflecting coating, approach the ideal solar collector characteristic of visible light absorber and infrared energy reflector.

  11. Process to form mesostructured films

    DOE Patents [OSTI]

    Brinker, C.J.; Anderson, M.T.; Ganguli, R.; Lu, Y.F.

    1999-01-12

    This invention comprises a method to form a family of supported films with pore size in the approximate range 0.8-20 nm exhibiting highly ordered microstructures and porosity derived from an ordered micellar or liquid-crystalline organic-inorganic precursor structure that forms during film deposition. Optically transparent, 100-500-nm thick films exhibiting a unique range of microstructures and uni-modal pore sizes are formed in seconds in a continuous coating operation. Applications of these films include sensors, membranes, low dielectric constant interlayers, anti-reflective coatings, and optical hosts. 12 figs.

  12. Magnetron sputtered boron films

    DOE Patents [OSTI]

    Makowiecki, D.M.; Jankowski, A.F.

    1998-06-16

    A method is described for the production of thin boron and titanium/boron films by magnetron sputter deposition. The amorphous boron films contain no morphological growth features, unlike those found when thin films are prepared by various physical vapor deposition processes. Magnetron sputter deposition method requires the use of a high density crystalline boron sputter target which is prepared by hot isostatic pressing. Thin boron films prepared by this method are useful for producing hardened surfaces, surfacing machine tools, etc. and for ultra-thin band pass filters as well as the low Z element in low Z/high Z optical components, such as mirrors which enhance reflectivity from grazing to normal incidence. 8 figs.

  13. Magnetron sputtered boron films

    DOE Patents [OSTI]

    Makowiecki, Daniel M.; Jankowski, Alan F.

    1998-01-01

    A method is described for the production of thin boron and titanium/boron films by magnetron sputter deposition. The amorphous boron films contain no morphological growth features, unlike those found when thin films are prepared by various physical vapor deposition processes. Magnetron sputter deposition method requires the use of a high density crystalline boron sputter target which is prepared by hot isostatic pressing. Thin boron films prepared by this method are useful for producing hardened surfaces, surfacing machine tools, etc. and for ultra-thin band pass filters as well as the low Z element in low Z/high Z optical components, such as mirrors which enhance reflectivity from grazing to normal incidence.

  14. Method and apparatus for measuring film spectral properties

    DOE Patents [OSTI]

    Forrest, Stephen R.; Burrows, Paul E.; Garbuzov, Dmitri Z.; Bulovic, Vladimir

    1999-12-21

    Film spectral properties are measured by projecting chopped monochromatic light onto a luminescent film sample deposited on a substrate, and coupling through use of immersion oil the reflection of light therefrom to a light detector.

  15. Scintillator reflective layer coextrusion

    DOE Patents [OSTI]

    Yun, Jae-Chul; Para, Adam

    2001-01-01

    A polymeric scintillator has a reflective layer adhered to the exterior surface thereof. The reflective layer comprises a reflective pigment and an adhesive binder. The adhesive binder includes polymeric material from which the scintillator is formed. A method of forming the polymeric scintillator having a reflective layer adhered to the exterior surface thereof is also provided. The method includes the steps of (a) extruding an inner core member from a first amount of polymeric scintillator material, and (b) coextruding an outer reflective layer on the exterior surface of the inner core member. The outer reflective layer comprises a reflective pigment and a second amount of the polymeric scintillator material.

  16. Neutron reflecting supermirror structure

    DOE Patents [OSTI]

    Wood, James L. (Drayton Plains, MI)

    1992-01-01

    An improved neutron reflecting supermirror structure comprising a plurality of stacked sets of bilayers of neutron reflecting materials. The improved neutron reflecting supermirror structure is adapted to provide extremely good performance at high incidence angles, i.e. up to four time the critical angle of standard neutron mirror structures. The reflection of neutrons striking the supermirror structure at a high critical angle provides enhanced neutron throughput, and hence more efficient and economical use of neutron sources.

  17. Neutron reflecting supermirror structure

    DOE Patents [OSTI]

    Wood, J.L.

    1992-12-01

    An improved neutron reflecting supermirror structure comprising a plurality of stacked sets of bilayers of neutron reflecting materials. The improved neutron reflecting supermirror structure is adapted to provide extremely good performance at high incidence angles, i.e. up to four time the critical angle of standard neutron mirror structures. The reflection of neutrons striking the supermirror structure at a high critical angle provides enhanced neutron throughput, and hence more efficient and economical use of neutron sources. 2 figs.

  18. Tandem resonator reflectance modulator

    DOE Patents [OSTI]

    Fritz, I.J.; Wendt, J.R.

    1994-09-06

    A wide band optical modulator is grown on a substrate as tandem Fabry-Perot resonators including three mirrors spaced by two cavities. The absorption of one cavity is changed relative to the absorption of the other cavity by an applied electric field, to cause a change in total reflected light, as light reflecting from the outer mirrors is in phase and light reflecting from the inner mirror is out of phase with light from the outer mirrors. 8 figs.

  19. Reflective diffraction grating

    DOE Patents [OSTI]

    Lamartine, Bruce C.

    2003-06-24

    Reflective diffraction grating. A focused ion beam (FIB) micromilling apparatus is used to store color images in a durable medium by milling away portions of the surface of the medium to produce a reflective diffraction grating with blazed pits. The images are retrieved by exposing the surface of the grating to polychromatic light from a particular incident bearing and observing the light reflected by the surface from specified reception bearing.

  20. Tandem resonator reflectance modulator

    DOE Patents [OSTI]

    Fritz, Ian J. (Albuquerque, NM); Wendt, Joel R. (Albuquerque, NM)

    1994-01-01

    A wide band optical modulator is grown on a substrate as tandem Fabry-Perot resonators including three mirrors spaced by two cavities. The absorption of one cavity is changed relative to the absorption of the other cavity by an applied electric field, to cause a change in total reflected light, as light reflecting from the outer mirrors is in phase and light reflecting from the inner mirror is out of phase with light from the outer mirrors.

  1. Nanocomposite films

    DOE Patents [OSTI]

    Mitlin, David; , Ophus, Colin; Evoy, Stephane; Radmilovic, Velimir; Mohammadi, Reza; Westra, Ken; Nelson-Fitzpatrick, Nathaniel; Lee, Zonghoon

    2010-07-20

    A thin-film composition of nanocrystal molybdenum in an amorphous metallic matrix may be formed by co-sputtering Mo with aluminum or nickel. NEMS cantilevers may be formed from the film. The films exhibit high nanoindentation hardness and a reduction in roughness and intrinsic stress, while maintaining resistivity in the metallic range.

  2. Neutron reflecting supermirror structure

    DOE Patents [OSTI]

    Wood, James L. (Drayton Plains, MI)

    1992-01-01

    An improved neutron reflecting supermirror structure comprising a plurality of stacked sets of bilayers of neutron reflecting materials. The improved neutron reflecting supermirror structure is adapted to provide extremely good performance at high incidence angles, i.e. up to four time the critical angle of standard neutron mirror structures. The reflection of neutrons striking the supermirror structure at a high critical angle provides enhanced neutron throughput, and hence more efficient and economical use of neutron sources. One layer of each set of bilayers consist of titanium, and the second layer of each set of bilayers consist of an alloy of nickel with carbon interstitially present in the nickel alloy.

  3. Renewable liquid reflection grating

    DOE Patents [OSTI]

    Ryutov, Dmitri D.; Toor, Arthur

    2003-10-07

    A renewable liquid reflection grating. Electrodes are operatively connected to a conducting liquid in an arrangement that produces a reflection grating and driven by a current with a resonance frequency. In another embodiment, the electrodes create the grating by a resonant electrostatic force acting on a dielectric liquid.

  4. Corrosion-resistant multilayer structures with improved reflectivity

    DOE Patents [OSTI]

    Soufli, Regina; Fernandez-Perea, Monica; Robinson, Jeff C.

    2013-04-09

    In one general embodiment, a thin film structure includes a substrate; a first corrosion barrier layer above the substrate; a reflective layer above the first corrosion barrier layer, wherein the reflective layer comprises at least one repeating set of sub-layers, wherein one of the sub-layers of each set of sub-layers being of a corrodible material; and a second corrosion barrier layer above the reflective layer. In another general embodiment, a system includes an optical element having a thin film structure as recited above; and an image capture or spectrometer device. In a further general embodiment, a laser according to one embodiment includes a light source and the thin film structure as recited above.

  5. Method of fabricating reflection-mode EUV diffraction elements

    DOE Patents [OSTI]

    Naulleau, Patrick P.

    2002-01-01

    Techniques for fabricating a well-controlled, quantized-level, engineered surface that serves as substrates for EUV reflection multilayer overcomes problems associated with the fabrication of reflective EUV diffraction elements. The technique when employed to fabricate an EUV diffraction element that includes the steps of: (a) forming an etch stack comprising alternating layers of first and second materials on a substrate surface where the two material can provide relative etch selectivity; (b) creating a relief profile in the etch stack wherein the relief profile has a defined contour; and (c) depositing a multilayer reflection film over the relief profile wherein the film has an outer contour that substantially matches that of the relief profile. For a typical EUV multilayer, if the features on the substrate are larger than 50 nm, the multilayer will be conformal to the substrate. Thus, the phase imparted to the reflected wavefront will closely match that geometrically set by the surface height profile.

  6. Film Vault

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Volume One Film Collection Volume Two 75th Anniversary Hydropower in the Northwest Woody Guthrie Videos Strategic Direction Branding & Logos Power of the River History Book...

  7. Carbonaceous film coating

    DOE Patents [OSTI]

    Maya, Leon

    1989-01-01

    A method of making a carbonaceous film comprising heating tris(1,3,2-benzodiazaborolo)borazine or dodecahydro tris[1,3,2]diazaborine[1,2-a:1'2'-c:1"2"-e]borazine in an inert atmosphere in the presence of a substrate to a temperature at which the borazine compound decomposes, and the decomposition products deposit onto the substrate to form a thin, tenacious, highly reflective conductive coating having a narrow band gap which is susceptible of modification and a relatively low coefficient of friction.

  8. Carbonaceous film coating

    DOE Patents [OSTI]

    Maya, L.

    1988-04-27

    A method of making a carbonaceous film comprising heating tris(1,3,2-benzodiazaborolo)borazine or dodecahydro tris(1,3,2)diazaborine(1,2-a:1'2'-c:1''2''-e)borazine in an inert atmosphere in the presence of a substrate to a temperature at which the borazine compound decomposes, and the decomposition products deposit onto the substrate to form a thin, tenacious, highly reflective conductive coating having a narrow band gap which is susceptible of modification and a relatively low coefficient of friction.

  9. Fabrication of optically reflecting ohmic contacts for semiconductor devices

    DOE Patents [OSTI]

    Sopori, Bhushan L.

    1995-01-01

    A method is provided to produce a low-resistivity ohmic contact having high optical reflectivity on one side of a semiconductor device. The contact is formed by coating the semiconductor substrate with a thin metal film on the back reflecting side and then optically processing the wafer by illuminating it with electromagnetic radiation of a predetermined wavelength and energy level through the front side of the wafer for a predetermined period of time. This method produces a thin epitaxial alloy layer between the semiconductor substrate and the metal layer when a crystalline substrate is used. The alloy layer provides both a low-resistivity ohmic contact and high optical reflectance.

  10. Electrochromic window with high reflectivity modulation

    DOE Patents [OSTI]

    Goldner, Ronald B.; Gerouki, Alexandra; Liu, Te-Yang; Goldner, Mark A.; Haas, Terry E.

    2000-01-01

    A multi-layered, active, thin film, solid-state electrochromic device having a high reflectivity in the near infrared in a colored state, a high reflectivity and transmissivity modulation when switching between colored and bleached states, a low absorptivity in the near infrared, and fast switching times, and methods for its manufacture and switching are provided. In one embodiment, a multi-layered device comprising a first indium tin oxide transparent electronic conductor, a transparent ion blocking layer, a tungsten oxide electrochromic anode, a lithium ion conducting-electrically resistive electrolyte, a complimentary lithium mixed metal oxide electrochromic cathode, a transparent ohmic contact layer, a second indium oxide transparent electronic conductor, and a silicon nitride encapsulant is provided. Through elimination of optional intermediate layers, simplified device designs are provided as alternative embodiments. Typical colored-state reflectivity of the multi-layered device is greater than 50% in the near infrared, bleached-state reflectivity is less than 40% in the visible, bleached-state transmissivity is greater than 60% in the near infrared and greater than 40% in the visible, and spectral absorbance is less than 50% in the range from 0.65-2.5 .mu.m.

  11. Polymer films

    DOE Patents [OSTI]

    Granick, Steve; Sukhishvili, Svetlana A.

    2008-12-30

    A film contains a first polymer having a plurality of hydrogen bond donating moieties, and a second polymer having a plurality of hydrogen bond accepting moieties. The second polymer is hydrogen bonded to the first polymer.

  12. Polymer films

    DOE Patents [OSTI]

    Granick, Steve; Sukhishvili, Svetlana A.

    2004-05-25

    A film contains a first polymer having a plurality of hydrogen bond donating moieties, and a second polymer having a plurality of hydrogen bond accepting moieties. The second polymer is hydrogen bonded to the first polymer.

  13. Reflective optical imaging system

    DOE Patents [OSTI]

    Shafer, David R.

    2000-01-01

    An optical system compatible with short wavelength (extreme ultraviolet) radiation comprising four reflective elements for projecting a mask image onto a substrate. The four optical elements are characterized in order from object to image as convex, concave, convex and concave mirrors. The optical system is particularly suited for step and scan lithography methods. The invention increases the slit dimensions associated with ringfield scanning optics, improves wafer throughput and allows higher semiconductor device density.

  14. reflecting-behavioral-processes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Reflecting Behavioral Processes In Integrated Models Of Activity-Travel Demand And Dynamic Network Supply: A Novel Event-Based Framework Presentation at Argonne TRACC March 16, 2012 10:00 AM(CDT) TRACC Conference Room: Building 222, Room D-233 Dr. Karthik Charan Konduri School of Sustainable Energy and the Built Environment Arizona State University Abstract The developments in the microsimulation modeling of two key components of the transportation system, namely, activity-travel demand and

  15. ADVANCED REFLECTIVE FILMS AND PANELS FOR NEXT GENERATION SOLAR...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    This presentation was delivered at the SunShot Concentrating Solar Power (CSP) Program Review 2013, held April 23-25, 2013 near Phoenix, Arizona. PDF icon cspreviewmeeting042313...

  16. ADVANCED REFLECTIVE FILMS AND PANELS FOR NEXT GENERATION SOLAR COLLECTORS

    Broader source: Energy.gov [DOE]

    This presentation was delivered at the SunShot Concentrating Solar Power (CSP) Program Review 2013, held April 23–25, 2013 near Phoenix, Arizona.

  17. Structural characterization of thin film photonic crystals

    SciTech Connect (OSTI)

    Subramania, G.; Biswas, R.; Constant, K.; Sigalas, M. M.; Ho, K. M.

    2001-06-15

    We quantitatively analyze the structure of thin film inverse-opal photonic crystals composed of ordered arrays of air pores in a background of titania. Ordering of the sphere template and introduction of the titania background were performed simultaneously in the thin film photonic crystals. Nondestructive optical measurements of backfilling with high refractive index liquids, angle-resolved reflectivity, and optical spectroscopy were combined with band-structure calculations. The analysis reveals a thin film photonic crystal structure with a very high filling fraction (92{endash}94%) of air and a substantial compression along the c axis ({similar_to}22{endash}25%).

  18. Renewable liquid reflecting zone plate

    DOE Patents [OSTI]

    Toor, Arthur; Ryutov, Dmitri D.

    2003-12-09

    A renewable liquid reflecting zone plate. Electrodes are operatively connected to a dielectric liquid in a circular or other arrangement to produce a reflecting zone plate. A system for renewing the liquid uses a penetrable substrate.

  19. Optical method for the determination of stress in thin films

    DOE Patents [OSTI]

    Maris, Humphrey J.

    1999-01-01

    A method and optical system is disclosed for measuring an amount of stress in a film layer disposed over a substrate. The method includes steps of: (A) applying a sequence of optical pump pulses to the film layer, individual ones of said optical pump pulses inducing a propagating strain pulse in the film layer, and for each of the optical pump pulses, applying at least one optical probe pulse, the optical probe pulses being applied with different time delays after the application of the corresponding optical probe pulses; (B) detecting variations in an intensity of a reflection of portions of the optical probe pulses, the variations being due at least in part to the propagation of the strain pulse in the film layer; (C) determining, from the detected intensity variations, a sound velocity in the film layer; and (D) calculating, using the determined sound velocity, the amount of stress in the film layer. In one embodiment of this invention the step of detecting measures a period of an oscillation in the intensity of the reflection of portions of the optical probe pulses, while in another embodiment the step of detecting measures a change in intensity of the reflection of portions of the optical probe pulses and determines a time at which the propagating strain pulse reflects from a boundary of the film layer.

  20. Optical method for the determination of stress in thin films

    DOE Patents [OSTI]

    Maris, H.J.

    1999-01-26

    A method and optical system is disclosed for measuring an amount of stress in a film layer disposed over a substrate. The method includes steps of: (A) applying a sequence of optical pump pulses to the film layer, individual ones of said optical pump pulses inducing a propagating strain pulse in the film layer, and for each of the optical pump pulses, applying at least one optical probe pulse, the optical probe pulses being applied with different time delays after the application of the corresponding optical probe pulses; (B) detecting variations in an intensity of a reflection of portions of the optical probe pulses, the variations being due at least in part to the propagation of the strain pulse in the film layer; (C) determining, from the detected intensity variations, a sound velocity in the film layer; and (D) calculating, using the determined sound velocity, the amount of stress in the film layer. In one embodiment of this invention the step of detecting measures a period of an oscillation in the intensity of the reflection of portions of the optical probe pulses, while in another embodiment the step of detecting measures a change in intensity of the reflection of portions of the optical probe pulses and determines a time at which the propagating strain pulse reflects from a boundary of the film layer. 16 figs.

  1. Microstructural and mechanical characteristics of Ni–Cr thin films

    SciTech Connect (OSTI)

    Petley, Vijay; Sathishkumar, S.; Thulasi Raman, K.H.; Rao, G.Mohan; Chandrasekhar, U.

    2015-06-15

    Highlights: • Ni–Cr thin films of varied composition deposited by DC magnetron co-sputtering. • Thin film with Ni–Cr: 80–20 at% composition exhibits most distinct behavior. • The films were tensile tested and exhibited no cracking till the substrate yielding. - Abstract: Ni–Cr alloy thin films have been deposited using magnetron co-sputtering technique at room temperature. Crystal structure was evaluated using GIXRD. Ni–Cr solid solution upto 40 at% of Cr exhibited fcc solid solution of Cr in Ni and beyond that it exhibited bcc solid solution of Ni in Cr. X-ray diffraction analysis shows formation of (1 1 1) fiber texture in fcc and (2 2 0) fiber texture in bcc Ni–Cr thin films. Electron microscopy in both in-plane and transverse direction of the film surface revealed the presence of columnar microstructure for films having Cr upto 40 at%. Mechanical properties of the films are evaluated using nanoindentation. The modulus values increased with increase of Cr at% till the film is fcc. With further increase in Cr at% the modulus values decreased. Ni–Cr film with 20 at% Ni exhibits reduction in modulus and is correlated to the poor crystallization of the film as reflected in XRD analysis. The Ni–Cr thin film with 80 at% Ni and 20 at% Cr exhibited the most distinct columnar structure with highest electrical resistivity, indentation hardness and elastic modulus.

  2. Reflection Survey | Open Energy Information

    Open Energy Info (EERE)

    (Gritto, Et Al.) Rye Patch Area Integrated Seismic Studies At The Rye Patch Geothermal Reservoir, Nevada Reflection Survey At Rye Patch Area (Laney, 2005) Rye Patch Area Federal...

  3. REFLECT HOME | Department of Energy

    Broader source: Energy.gov (indexed) [DOE]

    so it made sense for the California State University, Sacramento, team to showcase nature in its Solar Decathlon 2015 project. The team's Reflect Home does just that by...

  4. Optical Reflection Spectroscopy of Thick Corrosion Layers on 304 Stainless Steel

    SciTech Connect (OSTI)

    R Castelli; P Persans; W Strohmayer; V Parkinson

    2006-03-23

    Corrosion resistant structural materials of both iron and nickel based alloys are used in the electric power industry for the construction of the coolant loops of both conventional and nuclear power generating stations. These materials, in the presence of high temperature (e.g. 287 C), high pH (e.g. 10.0 {at} 20 C) water with dissolved hydrogen will oxidize and form corrosion films that are double metal oxides (or spinels) of the form AB{sub 2}O{sub 4}. This work describes optical reflectivity techniques that have been developed to study the growth of these films in situ. The optical technique uses a dual-beam specular reflection spectrometer to measure the spectrum of reflected light in small angle (i.e. < 15{sup o}) scatter. The reflection spectra are then calibrated using a set of corrosion coupons with corrosion films that are well known. Results are compared with models based on multilayer reflection and Mie scattering from a particle size distribution. Surface roughness is found to be the dominant cause of reduced reflection as the films grow.

  5. Ferroelectric ultrathin perovskite films

    DOE Patents [OSTI]

    Rappe, Andrew M; Kolpak, Alexie Michelle

    2013-12-10

    Disclosed herein are perovskite ferroelectric thin-film. Also disclosed are methods of controlling the properties of ferroelectric thin films. These films can be used in a variety materials and devices, such as catalysts and storage media, respectively.

  6. Magnetron sputtered boron films and Ti/B multilayer structures

    DOE Patents [OSTI]

    Makowiecki, D.M.; Jankowski, A.F.

    1995-02-14

    A method is described for the production of thin boron and titanium/boron films by magnetron sputter deposition. The amorphous boron films contain no morphological growth features, unlike those found when thin films are prepared by various physical vapor deposition processes. Magnetron sputter deposition method requires the use of a high density crystalline boron sputter target which is prepared by hot isostatic pressing. Thin boron films prepared by this method are useful for ultra-thin band pass filters as well as the low Z element in low Z/high Z mirrors which enhance reflectivity from grazing to normal incidence. 6 figs.

  7. Magnetron sputtered boron films and TI/B multilayer structures

    DOE Patents [OSTI]

    Makowiecki, Daniel M.; Jankowski, Alan F.

    1993-01-01

    A method is described for the production of thin boron and titanium/boron films by magnetron sputter deposition. The amorphous boron films contain no morphological growth features, unlike those found when thin films are prepared by various physical vapor deposition processes. Magnetron sputter deposition method requires the use of a high density crystalline boron sputter target which is prepared by hot isostatic pressing. Thin boron films prepared by this method are useful for ultra-thin band pass filters as well as the low Z element in low Z/high Z mirrors which enhance reflectivity from grazing to normal incidence.

  8. Magnetron sputtered boron films and TI/B multilayer structures

    DOE Patents [OSTI]

    Makowiecki, D.M.; Jankowski, A.F.

    1993-04-20

    A method is described for the production of thin boron and titanium/boron films by magnetron sputter deposition. The amorphous boron films contain no morphological growth features, unlike those found when thin films are prepared by various physical vapor deposition processes. Magnetron sputter deposition method requires the use of a high density crystalline boron sputter target which is prepared by hot isostatic pressing. Thin boron films prepared by this method are useful for ultra-thin band pass filters as well as the low Z element in low Z/high Z mirrors which enhance reflectivity from grazing to normal incidence.

  9. Magnetron sputtered boron films and Ti/B multilayer structures

    DOE Patents [OSTI]

    Makowiecki, Daniel M.; Jankowski, Alan F.

    1995-01-01

    A method is described for the production of thin boron and titanium/boron films by magnetron sputter deposition. The amorphous boron films contain no morphological growth features, unlike those found when thin films are prepared by various physical vapor deposition processes. Magnetron sputter deposition method requires the use of a high density crystalline boron sputter target which is prepared by hot isostatic pressing. Thin boron films prepared by this method are useful for ultra-thin band pass filters as well as the low Z element in low Z/high Z mirrors which enhance reflectivity from grazing to normal incidence.

  10. Extraordinary optical transmission in nanopatterned ultrathin metal films without holes

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Peer, Akshit; Biswas, Rana

    2016-02-01

    In this study, we experimentally and theoretically demonstrate that a continuous gold film on a periodically textured substrate exhibits extraordinary optical transmission, even though no holes were etched in the film. Our film synthesis started by nanoimprinting a periodic array of nanocups with a period of ~750 nm on a polystyrene film over a glass substrate. A thin non-conformal gold film was sputter-deposited on the polystyrene by angle-directed deposition. The gold film was continuous with spatial thickness variation, the film being thinnest at the bottom of the nanocup. Measurements revealed an extraordinary transmission peak at a wavelength just smaller thanmore » the period, with an enhancement of ~2.5 compared to the classically expected value. Scattering matrix simulations model well the transmission and reflectance measurements when an ultrathin gold layer (~5 nm), smaller than the skin depth is retained at the bottom of the nanocups. Electric field intensities are enhanced by >100 within the nanocup, and ~40 in the ultrathin gold layer causing transmission through it. We show a wavelength red-shift of ~30 nm in the extraordinary transmission peak when the nanocups are coated with a thin film of a few nanometers, which can be utilized for biosensing. The continuous corrugated metal films are far simpler structures to observe extraordinary transmission, circumventing the difficult process of etching the metal film. Such continuous metal films with ultrathin regions are simple platforms for non-linear optics, plasmonics, and biological and chemical sensing.« less

  11. Thin film solar energy collector

    DOE Patents [OSTI]

    Aykan, Kamran; Farrauto, Robert J.; Jefferson, Clinton F.; Lanam, Richard D.

    1983-11-22

    A multi-layer solar energy collector of improved stability comprising: (1) a substrate of quartz, silicate glass, stainless steel or aluminum-containing ferritic alloy; (2) a solar absorptive layer comprising silver, copper oxide, rhodium/rhodium oxide and 0-15% by weight of platinum; (3) an interlayer comprising silver or silver/platinum; and (4) an optional external anti-reflective coating, plus a method for preparing a thermally stable multi-layered solar collector, in which the absorptive layer is undercoated with a thin film of silver or silver/platinum to obtain an improved conductor-dielectric tandem.

  12. Device for translating negative film image to a line scan

    DOE Patents [OSTI]

    Dutton, G.W.

    1998-05-19

    A negative film reader records high-resolution optical density changes across negative film radiographic images to allow precise image dimensions to be determined. A laser light source capable of high-resolution focusing is passed through an intensity control filter, focused by a lens, and reflected off a mirror to focus in the plane of the negative film. The light transmitted through the film is collected by a second lens and directed to a photo diode detector which senses the transmitted intensity. The output of the photo diode signal amplifier is sent to the Y-axis input of an X-Y recorder. The film sample is transported in a plane perpendicular to the beam axis by means of a slide. The film position is monitored, with the signal amplified and recorded as the X-axis on the X-Y recorder. The linear dimensions and positions of image components can be determined by direct measurement of the amplified recording.

  13. Optical and mechanical properties of nanocrystalline ZrC thin films grown by pulsed laser deposition.

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Craciun, D.; Socol, G.; Lambers, E.; McCumiskey, E. J.; Taylor, C. R.; Martin, C.; Argibay, Nicolas; Craciun, V.; Tanner, D. B.

    2015-01-17

    Thin ZrC films (<500 nm) were grown on (100) Si substrates at a substrate temperature of 500 °C by the pulsed laser deposition (PLD) technique using a KrF excimer laser under different CH4 pressures. Glancing incidence X-ray diffraction showed that films were nanocrystalline, while X-ray reflectivity studies found out films were very dense and exhibited a smooth surface morphology. Optical spectroscopy data shows that the films have high reflectivity (>90%) in the infrared region, characteristic of metallic behavior. Nanoindentation results indicated that films deposited under lower CH4 pressures exhibited slightly higher nanohardness and Young modulus values than films deposited undermore » higher pressures. As a result, tribological characterization revealed that these films exhibited relatively high wear resistance and steady-state friction coefficients on the order of μ = 0.4.« less

  14. Optical and mechanical properties of nanocrystalline ZrC thin films grown by pulsed laser deposition.

    SciTech Connect (OSTI)

    Craciun, D.; Socol, G.; Lambers, E.; McCumiskey, E. J.; Taylor, C. R.; Martin, C.; Argibay, Nicolas; Craciun, V.; Tanner, D. B.

    2015-01-17

    Thin ZrC films (<500 nm) were grown on (100) Si substrates at a substrate temperature of 500 °C by the pulsed laser deposition (PLD) technique using a KrF excimer laser under different CH4 pressures. Glancing incidence X-ray diffraction showed that films were nanocrystalline, while X-ray reflectivity studies found out films were very dense and exhibited a smooth surface morphology. Optical spectroscopy data shows that the films have high reflectivity (>90%) in the infrared region, characteristic of metallic behavior. Nanoindentation results indicated that films deposited under lower CH4 pressures exhibited slightly higher nanohardness and Young modulus values than films deposited under higher pressures. As a result, tribological characterization revealed that these films exhibited relatively high wear resistance and steady-state friction coefficients on the order of μ = 0.4.

  15. Reduction of Glass Surface Reflectance by Ion Beam Surface Modification

    SciTech Connect (OSTI)

    Mark Spitzer

    2011-03-11

    This is the final report for DOE contract DE-EE0000590. The purpose of this work was to determine the feasibility of the reduction of the reflection from the front of solar photovoltaic modules. Reflection accounts for a power loss of approximately 4%. A solar module having an area of one square meter with an energy conversion efficiency of 18% generates approximately 180 watts. If reflection loss can be eliminated, the power output can be increased to 187 watts. Since conventional thin-film anti-reflection coatings do not have sufficient environmental stability, we investigated the feasibility of ion beam modification of the glass surface to obtain reduction of reflectance. Our findings are generally applicable to all solar modules that use glass encapsulation, as well as commercial float glass used in windows and other applications. Ion implantation of argon, fluorine, and xenon into commercial low-iron soda lime float glass, standard float glass, and borosilicate glass was studied by implantation, annealing, and measurement of reflectance. The three ions all affected reflectance. The most significant change was obtained by argon implantation into both low-iron and standard soda-lime glass. In this way samples were formed with reflectance lower than can be obtained with a single-layer coatings of magnesium fluoride. Integrated reflectance was reduced from 4% to 1% in low-iron soda lime glass typical of the glass used in solar modules. The reduction of reflectance of borosilicate glass was not as large; however borosilicate glass is not typically used in flat plate solar modules. Unlike conventional semiconductor ion implantation doping, glass reflectance reduction was found to be tolerant to large variations in implant dose, meaning that the process does not require high dopant uniformity. Additionally, glass implantation does not require mass analysis. Simple, high current ion implantation equipment can be developed for this process; however, before the process can be employed on full scale solar modules, equipment must be developed for ion implanting large sheets of glass. A cost analysis shows that the process can be economical. Our finding is that the reduction of reflectance by ion beam surface modification is technically and economically feasible. The public will benefit directly from this work by the improvement of photovoltaic module efficiency, and indirectly by the greater understanding of the modification of glass surfaces by ion beams.

  16. Method of fabricating reflection-mode EUV diffusers

    DOE Patents [OSTI]

    Anderson, Erik; Naulleau, Patrick P.

    2005-03-01

    Techniques for fabricating well-controlled, random relief, engineered surfaces that serve as substrates for EUV optical devices are accomplished with grayscale exposure. The method of fabricating a multilevel EUV optical element includes: (a) providing a substrate; (b) depositing a layer of curable material on a surface of the substrate; (c) creating a relief profile in a layer of cured material from the layer of curable material wherein the relief profile comprises multiple levels of cured material that has a defined contour; and (d) depositing a multilayer reflection film over the relief profile wherein the film has an outer contour that substantially matches that of the relief profile. The curable material can comprise photoresist or a low dielectric constant material.

  17. Low reflectance radio frequency load

    DOE Patents [OSTI]

    Ives, R. Lawrence; Mizuhara, Yosuke M

    2014-04-01

    A load for traveling microwave energy has an absorptive volume defined by cylindrical body enclosed by a first end cap and a second end cap. The first end cap has an aperture for the passage of an input waveguide with a rotating part that is coupled to a reflective mirror. The inner surfaces of the absorptive volume consist of a resistive material or are coated with a coating which absorbs a fraction of incident RF energy, and the remainder of the RF energy reflects. The angle of the reflector and end caps is selected such that reflected RF energy dissipates an increasing percentage of the remaining RF energy at each reflection, and the reflected RF energy which returns to the rotating mirror is directed to the back surface of the rotating reflector, and is not coupled to the input waveguide. Additionally, the reflector may have a surface which generates a more uniform power distribution function axially and laterally, to increase the power handling capability of the RF load. The input waveguide may be corrugated for HE11 mode input energy.

  18. Reflective coherent spatial light modulator

    DOE Patents [OSTI]

    Simpson, John T.; Richards, Roger K.; Hutchinson, Donald P.; Simpson, Marcus L.

    2003-04-22

    A reflective coherent spatial light modulator (RCSLM) includes a subwavelength resonant grating structure (SWS), the SWS including at least one subwavelength resonant grating layer (SWL) have a plurality of areas defining a plurality of pixels. Each pixel represents an area capable of individual control of its reflective response. A structure for modulating the resonant reflective response of at least one pixel is provided. The structure for modulating can include at least one electro-optic layer in optical contact with the SWS. The RCSLM is scalable in both pixel size and wavelength. A method for forming a RCSLM includes the steps of selecting a waveguide material and forming a SWS in the waveguide material, the SWS formed from at least one SWL, the SWL having a plurality of areas defining a plurality of pixels.

  19. Tunable electrical and optical properties of hafnium nitride thin films

    SciTech Connect (OSTI)

    Farrell, I. L.; Reeves, R. J.; Preston, A. R. H.; Ludbrook, B. M.; Ruck, B. J.; Downes, J. E.; Durbin, S. M.

    2010-02-15

    We report structural and electronic properties of epitaxial hafnium nitride films grown on MgO by plasma-assisted pulsed laser deposition. The electronic structure measured using soft x-ray absorption and emission spectroscopy is in excellent agreement with the results of a band structure calculation. We show that by varying the growth conditions we can extend the films' reflectance further toward the UV, and we relate this observation to the electronic structure.

  20. Polarization Studies of Resonant Forbidden Reflections in Liquid Crystals

    SciTech Connect (OSTI)

    Fernandes, P.; Barois, P.; Nguyen, H. T.; Wang, S. T.; Liu, Z. Q.; McCoy, B. K.; Huang, C. C.; Pindak, R.; Caliebe, W.

    2007-11-30

    We report the results of resonant x-ray diffraction experiments performed on thick films of a biaxial liquid crystal made of achiral bent-core molecules. Polarization properties of forbidden reflections are observed as a function of the sample rotation angle {phi} about the scattering vector Q for the first time on a fluid material. The experimental data are successfully analyzed within a tensor structure factor model by taking the nonperfect alignment of the liquid crystal into account. The local structure of the B{sub 2} mesophase is hence determined to be SmC{sub S}P{sub A}.

  1. NREL and SkyFuel Partnership Reflects Bright Future for Solar Energy | NREL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    NREL and SkyFuel Partnership Reflects Bright Future for Solar Energy In this video, NREL Principal Scientist Gary Jorgensen and SkyFuel Chief Technology Officer Randy Gee talk about their partnership to develop a thin film to substitute for bulkier glass mirrors on solar-collecting parabolic troughs. Learn more about NREL's Concentrating Solar Power Research

  2. Structural characterization of metastable hcp-Ni thin films epitaxially grown on Au(100) single-crystal underlayers

    SciTech Connect (OSTI)

    Ohtake, Mitsuru; Tanaka, Takahiro; Futamoto, Masaaki; Kirino, Fumiyoshi

    2010-05-15

    Ni(1120) epitaxial thin films with hcp structure were prepared on Au(100) single-crystal underlayers at 100 deg. C by ultra high vacuum molecular beam epitaxy. The detailed film structure is studied by in situ reflection high energy electron diffraction, x-ray diffraction, and transmission electron microscopy. The hcp-Ni film consists of two types of variants whose c-axes are rotated around the film normal by 90 deg. each other. An atomically sharp boundary is recognized between the film and the underlayer, where misfit dislocations are introduced. Presence of such dislocations seems to relieve the strain caused by the lattice mismatch between the film and the underlayer.

  3. Reflected beam illumination microscopy using a microfluidics...

    Office of Scientific and Technical Information (OSTI)

    Reflected beam illumination microscopy using a microfluidics device - progress report 6152014. Citation Details In-Document Search Title: Reflected beam illumination microscopy ...

  4. Deuterium phase behavior in thin-film Pd

    SciTech Connect (OSTI)

    Munter, A.E.; Heuser, B.J.

    1998-07-01

    The absorption of deuterium from the gas phase into two Pd thin films 668 {Angstrom} and 1207 {Angstrom} thick was measured at room temperature with {ital in situ} neutron reflectometry. Room-temperature solubility isothermal curves, out-of-plane film expansion, and deuterium depth profiles were determined from fits to the neutron reflectivity data. The measurements demonstrate that the deuterium solubility behavior, both in solid solution and within the two-phase region, is strongly perturbed by the thin-film geometry, consistent with previous solubility measurements in the published literature. The phase behavior investigated here was observed to depend on film thickness and on deuterium cycling through the two-phase region. The 668-{Angstrom} film exhibited the greatest initial phase perturbation and most significant changes upon cycling. Upon repeated cycling, both films approach nearly identical deuterium isothermal solubility and out-of-plane expansion behaviors. The observed equilibrium out-of-plane expansion behavior was consistent with the films expanding under an in-plane clamping constraint imposed by the substrate. The effect of this substrate constraining force is to amplify the out-of-plane expansion beyond that expected in bulk Pd. Taken together, these measurements implicate the film/substrate interfacial clamping interaction as the origin of the perturbed hydrogen phase behavior in thin-film geometry. {copyright} {ital 1998} {ital The American Physical Society}

  5. Low-Cost, Highly Transparent, Flexible, Low-Emission Coating Film to Enable

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Electrochromic Windows with Increased Energy Savings | Department of Energy Highly Transparent, Flexible, Low-Emission Coating Film to Enable Electrochromic Windows with Increased Energy Savings Low-Cost, Highly Transparent, Flexible, Low-Emission Coating Film to Enable Electrochromic Windows with Increased Energy Savings ITN Energy Systems is using low-cost, high volume roll-to-roll coating techniques to develop a new low-e film with high visible transmission and high infrared reflectivity.

  6. Methods for producing complex films, and films produced thereby (Patent) |

    Office of Scientific and Technical Information (OSTI)

    SciTech Connect Methods for producing complex films, and films produced thereby Citation Details In-Document Search Title: Methods for producing complex films, and films produced thereby A method for producing a film, the method comprising melting a layer of precursor particles on a substrate until at least a portion of the melted particles are planarized and merged to produce the film. The invention is also directed to a method for producing a photovoltaic film, the method comprising

  7. AntiReflection Coating D

    SciTech Connect (OSTI)

    AIKEN,DANIEL J.

    1999-09-23

    Analytical expressions used to optimize AR coatings for single junction solar cells are extended for use in monolithic, series interconnected multi-junction solar cell AR coating design. The result is an analytical expression which relates the solar cell performance (through J{sub sc}) directly to the AR coating design through the device reflectance. It is also illustrated how AR coating design be used to provide an additional degree of freedom for current matching multi-junction devices.

  8. Coatings on reflective mask substrates

    DOE Patents [OSTI]

    Tong, William Man-Wai; Taylor, John S.; Hector, Scott D.; Mangat, Pawitter J. S.; Stivers, Alan R.; Kofron, Patrick G.; Thompson, Matthew A.

    2002-01-01

    A process for creating a mask substrate involving depositing: 1) a coating on one or both sides of a low thermal expansion material EUVL mask substrate to improve defect inspection, surface finishing, and defect levels; and 2) a high dielectric coating, on the backside to facilitate electrostatic chucking and to correct for any bowing caused by the stress imbalance imparted by either other deposited coatings or the multilayer coating of the mask substrate. An film, such as TaSi, may be deposited on the front side and/or back of the low thermal expansion material before the material coating to balance the stress. The low thermal expansion material with a silicon overlayer and a silicon and/or other conductive underlayer enables improved defect inspection and stress balancing.

  9. Mirror: Visually reflecting C{sup ++}

    SciTech Connect (OSTI)

    Orosco, R.; Campo, M.; Sole, J.P.

    1995-12-31

    Reflection is the ability of a system to inspect and change a model of itself. This ability allows to transparently control and extend the functionality of an existing system without performing any changes to the system itself. In dynamic object-oriented languages like CLOS or Smalltalk. the reflective ability is supported directly by the language. In C++, in contrast, reflection must be provided by some form of code annotation and pre-processing. In most cases, this approach either requires modification of the system code, or just supports the reflection of entire classes but not the reflection of determined objects. This work presents the Mirror environment that supports C++ reflective programming through visual association of meta-classes to classes. It allows full transparent reflection of objects using three-dimensional presentations of the different architecture levels. The environment adds reflective ability to C++ classes without any code modification visible to the user, as well as dynamically selective reflection of objects.

  10. Discharge lamp with reflective jacket

    DOE Patents [OSTI]

    MacLennan, Donald A.; Turner, Brian P.; Kipling, Kent

    2001-01-01

    A discharge lamp includes an envelope, a fill which emits light when excited disposed in the envelope, a source of excitation power coupled to the fill to excite the fill and cause the fill to emit light, and a reflector disposed around the envelope and defining an opening, the reflector being configured to reflect some of the light emitted by the fill back into the fill while allowing some light to exit through the opening. The reflector may be made from a material having a similar thermal index of expansion as compared to the envelope and which is closely spaced to the envelope. The envelope material may be quartz and the reflector material may be either silica or alumina. The reflector may be formed as a jacket having a rigid structure which does not adhere to the envelope. The lamp may further include an optical clement spaced from the envelope and configured to reflect an unwanted component of light which exited the envelope back into the envelope through the opening in the reflector. Light which can be beneficially recaptured includes selected wavelength regions, a selected polarization, and selected angular components.

  11. Amorphous diamond films

    DOE Patents [OSTI]

    Falabella, Steven (Livermore, CA)

    1998-01-01

    Amorphous diamond films having a significant reduction in intrinsic stress are prepared by biasing a substrate to be coated and depositing carbon ions thereon under controlled temperature conditions.

  12. Porous thin films

    DOE Patents [OSTI]

    Xu, Ting

    2015-11-17

    Compositions of porous thin films and methods of making are provided. The methods involve self-assembly of a cyclic peptide in the presence of a block copolymer.

  13. Film Collection Volume One

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Volume One Film Collection Volume Two 75th Anniversary Hydropower in the Northwest Woody Guthrie Videos Strategic Direction Branding & Logos Power of the River History Book...

  14. BPA Historical Films Promo

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Volume One Film Collection Volume Two 75th Anniversary Hydropower in the Northwest Woody Guthrie Videos Strategic Direction Branding & Logos Power of the River History Book...

  15. Film Collection Volume Two

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    sag it for the best transmission of high-voltage electricity. It features wonderful animation and tower models. The next film, "The World Behind Your Light Switch" (1966),...

  16. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lensless X-Ray Imaging in Reflection Lensless X-Ray Imaging in Reflection Print Wednesday, 26 October 2011 00:00 The advent of x-ray free-electron laser (XFEL) light sources has...

  17. Microsoft Word - Rapid Reflective Facet Characterization Using...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ... VSHOT uses a laser, reflected off the facet, and a target to characterize the location of the reflected vector. From this, the surface slope at each selected location can be ...

  18. NREL: Measurements and Characterization - Reflectance Spectroscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Reflectance Spectroscopy In a fraction of a second, the photovoltaic (PV) Reflectometer measures the reflectance spectrum of a wafer or cell that is dimensionally within 6 in. × 6 in. The measured reflectance plots are deconvolved to derive physical parameters including surface roughness and texture, antireflective coating thickness, metallization area and height, and backside metallization properties. Pair of drawings showing how direct normal incident light reflects in a scatter from a rough

  19. Damage thresholds of thin film materials and high reflectors at 248 nm

    SciTech Connect (OSTI)

    Rainer, F.; Lowdermilk, W.H.; Milam, D.; Carniglia, C.K.; Hart, T.T.; Lichtenstein, T.L.

    1982-01-01

    Twenty-ns, 248-nm KrF laser pulses were used to measure laser damage thresholds for halfwave-thick layers of 15 oxide and fluoride coating materials, and for high reflectance coatings made with 13 combinations of these materials. The damage thresholds of the reflectors and single-layer films were compared to measurements of several properties of the halfwave-thick films to determine whether measurements of these properties of single-layer films to determine whether measurements of these properties of single-layer films were useful for identifying materials for fabrication of damage resistant coatings.

  20. Thin-film Rechargeable Lithium Batteries for Implantable Devices

    DOE R&D Accomplishments [OSTI]

    Bates, J. B.; Dudney, N. J.

    1997-05-01

    Thin films of LiCoO{sub 2} have been synthesized in which the strongest x ray reflection is either weak or missing, indicating a high degree of preferred orientation. Thin film solid state batteries with these textured cathode films can deliver practical capacities at high current densities. For example, for one of the cells 70% of the maximum capacity between 4.2 V and 3 V ({approximately}0.2 mAh/cm{sup 2}) was delivered at a current of 2 mA/cm{sup 2}. When cycled at rates of 0.1 mA/cm{sup 2}, the capacity loss was 0.001%/cycle or less. The reliability and performance of Li LiCoO{sub 2} thin film batteries make them attractive for application in implantable devices such as neural stimulators, pacemakers, and defibrillators.

  1. Method for providing mirror surfaces with protective strippable polymeric film

    DOE Patents [OSTI]

    Edwards, Charlene C.; Day, Jack R.

    1980-01-01

    This invention is a method for forming a protective, strippable, elastomeric film on a highly reflective surface. The method is especially well suited for protecting diamond-machined metallic mirrors, which are susceptible not only to abrasion and mechanical damage but also to contamination and corrosion by various fluids. In a typical use of the invention, a diamond-machined copper mirror surface is coated uniformly with a solution comprising a completely polymerized and completely cured thermoplastic urethane elastomer dissolved in tetrahydrofuran. The applied coating is evaporated to dryness, forming a tough, adherent, impermeable, and transparent film which encapsulates dust and other particulates on the surface. The film may be left in place for many months. When desired, the film may be stripped intact, removing the entrapped particulates and leaving no residue on the mirror surface.

  2. Thick film hydrogen sensor

    DOE Patents [OSTI]

    Hoffheins, B.S.; Lauf, R.J.

    1995-09-19

    A thick film hydrogen sensor element includes an essentially inert, electrically-insulating substrate having deposited thereon a thick film metallization forming at least two resistors. The metallization is a sintered composition of Pd and a sinterable binder such as glass frit. An essentially inert, electrically insulating, hydrogen impermeable passivation layer covers at least one of the resistors. 8 figs.

  3. Thick film hydrogen sensor

    DOE Patents [OSTI]

    Hoffheins, Barbara S. (Knoxville, TN); Lauf, Robert J. (Oak Ridge, TN)

    1995-01-01

    A thick film hydrogen sensor element includes an essentially inert, electrically-insulating substrate having deposited thereon a thick film metallization forming at least two resistors. The metallization is a sintered composition of Pd and a sinterable binder such as glass frit. An essentially inert, electrically insulating, hydrogen impermeable passivation layer covers at least one of the resistors.

  4. Stabilized chromium oxide film

    DOE Patents [OSTI]

    Nyaiesh, A.R.; Garwin, E.L.

    1986-08-04

    Stabilized air-oxidized chromium films deposited on high-power klystron ceramic windows and sleeves having a thickness between 20 and 150A are useful in lowering secondary electron emission yield and in avoiding multipactoring and window failure due to overheating. The ceramic substrate for the film is chosen from alumina, sapphire or beryllium oxide.

  5. Stabilized chromium oxide film

    DOE Patents [OSTI]

    Garwin, Edward L.; Nyaiesh, Ali R.

    1988-01-01

    Stabilized air-oxidized chromium films deposited on high-power klystron ceramic windows and sleeves having a thickness between 20 and 150.ANG. are useful in lowering secondary electron emission yield and in avoiding multipactoring and window failure due to overheating. The ceramic substrate for the film is chosen from alumina, sapphire or beryllium oxide.

  6. TEM characterization of nanodiamond thin films.

    SciTech Connect (OSTI)

    Qin, L.-C.; Zhou, D.; Krauss, A. R.; Gruen, D. M.; Chemistry

    1998-05-01

    The microstructure of thin films grown by microwave plasma-enhanced chemical vapor deposition (MPCVD) from fullerene C{sub 60} precursors has been characterized by scanning electron microscopy (SEM), selected-area electron diffraction (SAED), bright-field electron microscopy, high-resolution electron microscopy (HREM), and parallel electron energy loss spectroscopy (PEELS). The films are composed of nanosize crystallites of diamond, and no graphitic or amorphous phases were observed. The diamond crystallite size measured from lattice images shows that most grains range between 3-5 nm, reflecting a gamma distribution. SAED gave no evidence of either sp2-bonded glassy carbon or sp3-bonded diamondlike amorphous carbon. The sp2-bonded configuration found in PEELS was attributed to grain boundary carbon atoms, which constitute 5-10% of the total. Occasionally observed larger diamond grains tend to be highly faulted.

  7. Polaron absorption in amorphous tungsten oxide films

    SciTech Connect (OSTI)

    Berggren, Lars; Azens, Andris; Niklasson, Gunnar A.

    2001-08-15

    Amorphous thin films of tungsten oxide were deposited by sputtering onto glass substrates covered by conductive indium--tin oxide. The density and stoichiometry were determined by Rutherford backscattering spectrometry. Lithium ions were intercalated electrochemically into the films. The optical reflectance and transmittance were measured in the wavelength range from 0.3 to 2.5 {mu}m, at a number of intercalation levels. The polaron absorption peak becomes more symmetric and shifts to higher energies until an intercalation level of 0.25 to 0.3 Li{sup +}/W, where a saturation occurs. The shape of the polaron peak is in very good agreement with the theory of Bryksin [Fiz. Tverd. Tela 24, 1110 (1982)]. Within this model, the shift of the absorption peak is interpreted as an increase in the Fermi level of the material as more Li ions are inserted. {copyright} 2001 American Institute of Physics.

  8. Condenser optic with sacrificial reflective surface

    DOE Patents [OSTI]

    Tichenor, Daniel A.; Kubiak, Glenn D.; Lee, Sang Hun

    2006-07-25

    Employing collector optics that have a sacrificial reflective surface can significantly prolong the useful life of the collector optics and the overall performance of the condenser in which the collector optics are incorporated. The collector optics are normally subject to erosion by debris from laser plasma source of radiation. The presence of an upper sacrificial reflective surface over the underlying reflective surface effectively increases the life of the optics while relaxing the constraints on the radiation source. Spatial and temporally varying reflectivity that results from the use of the sacrificial reflective surface can be accommodated by proper condenser design.

  9. Condenser optic with sacrificial reflective surface

    DOE Patents [OSTI]

    Tichenor, Daniel A.; Kubiak, Glenn D.; Lee, Sung Hun

    2007-07-03

    Employing collector optics that has a sacrificial reflective surface can significantly prolong the useful life of the collector optics and the overall performance of the condenser in which the collector optics are incorporated. The collector optics is normally subject to erosion by debris from laser plasma source of radiation. The presence of an upper sacrificial reflective surface over the underlying reflective surface effectively increases the life of the optics while relaxing the constraints on the radiation source. Spatial and temporally varying reflectivity that results from the use of the sacrificial reflective surface can be accommodated by proper condenser design.

  10. SU-E-T-322: The Evaluation of the Gafchromic EBT3 Film in Low Dose 6 MV X-Ray Beams with Different Scanning Modes

    SciTech Connect (OSTI)

    Lee, H; Sung, J; Yoon, M; Kim, D; Chung, W

    2014-06-01

    Purpose: We have evaluated the response of the Gafchromic EBT3 film in low dose for 6 MV x-ray beams with two scanning modes, the reflection scanning mode and the transmission scanning mode. Methods: We irradiated the Gafcromic EBT3 film using a 60 degree enhanced dynamic wedge (EDW) with 6 MV x-ray beams from Clinac iX Linear accelerator (Varian Medical Systems, Palo Alto, CA). The irradiated Gafchromic EBT3 film was scanned with different scanning modes, the reflection scanning mode and the transmission scanning mode. The scanned Gafchromic EBT3 film was analyzed with MATLAB. Results: When 7.2 cGy was irradiated to the Gafchromic EBT3 film, the uncertainty was 0.54 cGy with reflection scanning mode and was 0.88 cGy with transmission scanning mode. When 24 cGy was irradiated to the Gafchromic EBT3 film, the uncertainty was similar to the case of 7.2 cGy irradiation showing 0.51 cGy of uncertainty with reflection scanning mode and 0.87 cGy of uncertainty with transmission scanning mode. The result suggests that the reflection mode should be used in Gafchromic EBT3 film for low irradiation. Conclusion: The result suggests that the reflection mode should be used in Gafchromic EBT3 film for low irradiation.

  11. Free-Space Time-Domain Method for Measuring Thin Film Dielectric Properties

    DOE Patents [OSTI]

    Li, Ming; Zhang, Xi-Cheng; Cho, Gyu Cheon

    2000-05-02

    A non-contact method for determining the index of refraction or dielectric constant of a thin film on a substrate at a desired frequency in the GHz to THz range having a corresponding wavelength larger than the thickness of the thin film (which may be only a few microns). The method comprises impinging the desired-frequency beam in free space upon the thin film on the substrate and measuring the measured phase change and the measured field reflectance from the reflected beam for a plurality of incident angles over a range of angles that includes the Brewster's angle for the thin film. The index of refraction for the thin film is determined by applying Fresnel equations to iteratively calculate a calculated phase change and a calculated field reflectance at each of the plurality of incident angles, and selecting the index of refraction that provides the best mathematical curve fit with both the dataset of measured phase changes and the dataset of measured field reflectances for each incident angle. The dielectric constant for the thin film can be calculated as the index of refraction squared.

  12. Thin film hydrogen sensor

    DOE Patents [OSTI]

    Cheng, Yang-Tse; Poli, Andrea A.; Meltser, Mark Alexander

    1999-01-01

    A thin film hydrogen sensor, includes: a substantially flat ceramic substrate with first and second planar sides and a first substrate end opposite a second substrate end; a thin film temperature responsive resistor on the first planar side of the substrate proximate to the first substrate end; a thin film hydrogen responsive metal resistor on the first planar side of the substrate proximate to the fist substrate end and proximate to the temperature responsive resistor; and a heater on the second planar side of the substrate proximate to the first end.

  13. Thin film hydrogen sensor

    DOE Patents [OSTI]

    Cheng, Y.T.; Poli, A.A.; Meltser, M.A.

    1999-03-23

    A thin film hydrogen sensor includes a substantially flat ceramic substrate with first and second planar sides and a first substrate end opposite a second substrate end; a thin film temperature responsive resistor on the first planar side of the substrate proximate to the first substrate end; a thin film hydrogen responsive metal resistor on the first planar side of the substrate proximate to the fist substrate end and proximate to the temperature responsive resistor; and a heater on the second planar side of the substrate proximate to the first end. 5 figs.

  14. Photovoltaic module with light reflecting backskin

    DOE Patents [OSTI]

    Gonsiorawski, Ronald C.

    2007-07-03

    A photovoltaic module comprises electrically interconnected and mutually spaced photovoltaic cells that are encapsulated by a light-transmitting encapsulant between a light-transparent front cover and a back cover, with the back cover sheet being an ionomer/nylon alloy embossed with V-shaped grooves running in at least two directions and coated with a light reflecting medium so as to provide light-reflecting facets that are aligned with the spaces between adjacent cells and oriented so as to reflect light falling in those spaces back toward said transparent front cover for further internal reflection onto the solar cells, whereby substantially all of the reflected light will be internally reflected from said cover sheet back to the photovoltaic cells, thereby increasing the current output of the module. The internal reflector improves power output by as much as 67%.

  15. Silicon-film{trademark} on ceramic solar cells. Final report

    SciTech Connect (OSTI)

    Hall, R.B.; Bacon, C.; DiReda, V.; Ford, D.H.; Ingram, A.E.; Lampo, S.M.; Rand, J.A.; Ruffins, T.R.; Barnett, A.M.

    1993-02-01

    The Silicon-Film{trademark} design achieves high performance through the use of a thin silicon layer. Optimally designed thin crystalline solar cells (<50 microns thick) have performance advantages over conventional thick devices. The enhancement in performance requires the incorporation of back-surface passivation and light trapping. The high-performance Silicon-Film{trademark} design employs a metallurgical barrier between the low-cost substrate and the thin silicon layer. The properties of the metallurgical barrier must be engineered to implement specific device requirements, such as high back-surface reflectivity. Recent advances in process development are described here.

  16. Solar Reflection Panels - Energy Innovation Portal

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Solar Thermal Solar Thermal Solar Photovoltaic Solar Photovoltaic Find More Like This Return to Search Solar Reflection Panels Sandia National Laboratories Contact SNL About This ...

  17. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    demonstrate for the first time a lensless x-ray imaging technique involving holographic principles and carried out in reflection (as opposed to transmission) geometry. The...

  18. Nanostructured thermoplastic polyimide films

    DOE Patents [OSTI]

    Aglan, Heshmat

    2015-05-19

    Structured films containing multi-walled carbon nanotubes ("MWCNTs") have enhanced mechanical performance in terms of strength, fracture resistance, and creep recovery of polyimide ("PI") films. Preferably, the loadings of MWCNTs can be in the range of 0.1 wt % to 0.5 wt %. The strength of the new PI films dried at 60.degree. C. increased by 55% and 72% for 0.1 wt % MWCNT and 0.5 wt % MWCNT loadings, respectively, while the fracture resistance increased by 23% for the 0.1 wt % MWCNTs and then decreases at a loading of 0.5 wt % MWCNTs. The films can be advantageously be created by managing a corresponding shift in the annealing temperature at which the maximum strength occurs as the MWCNT loadings increase.

  19. Amorphous diamond films

    DOE Patents [OSTI]

    Falabella, S.

    1998-06-09

    Amorphous diamond films having a significant reduction in intrinsic stress are prepared by biasing a substrate to be coated and depositing carbon ions thereon under controlled temperature conditions. 1 fig.

  20. Quantitative film radiography

    SciTech Connect (OSTI)

    Devine, G.; Dobie, D.; Fugina, J.; Hernandez, J.; Logan, C.; Mohr, P.; Moss, R.; Schumacher, B.; Updike, E.; Weirup, D.

    1991-02-26

    We have developed a system of quantitative radiography in order to produce quantitative images displaying homogeneity of parts. The materials that we characterize are synthetic composites and may contain important subtle density variations not discernible by examining a raw film x-radiograph. In order to quantitatively interpret film radiographs, it is necessary to digitize, interpret, and display the images. Our integrated system of quantitative radiography displays accurate, high-resolution pseudo-color images in units of density. We characterize approximately 10,000 parts per year in hundreds of different configurations and compositions with this system. This report discusses: the method; film processor monitoring and control; verifying film and processor performance; and correction of scatter effects.

  1. TAMPERPROOF FILM BADGE

    DOE Patents [OSTI]

    Kocher, L.F.

    1958-10-01

    A persornel dosimeter film badge made of plastic, with provision for a picture of the wearer and an internal slide containing photographic film that is sensitive to various radiations, is described. Four windows made of differing material selectively attenuate alpha, beta, gamma rays, and neutrons so as to distinguish the particular type of radiation the wearer was subjected to. In addition, a lead shield has the identification number of the wearer perforated thereon so as to identify the film after processing. An internal magnetically actuated latch securely locks the slide within the body, and may be withdrawn only upon the external application of two strong magnetic forces in order to insure that the wearer or other curious persons will not accidentally expose the film to visual light.

  2. Magnetoresistance of Au films

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhang, D. L.; Song, X. H.; Zhang, X; Zhang, Xiaoguang

    2014-01-01

    Measurement of the magnetoresistance (MR) of Au films as a function of temperature and film thickness reveals a strong dependence on grain size distribution and clear violation of the Kohler s rule. Using a model of random resistor network, we show that this result can be explained if the MR arises entirely from inhomogeneity due to grain boundary scattering and thermal activation of grain boundary atoms.

  3. Thin film tritium dosimetry

    DOE Patents [OSTI]

    Moran, Paul R.

    1976-01-01

    The present invention provides a method for tritium dosimetry. A dosimeter comprising a thin film of a material having relatively sensitive RITAC-RITAP dosimetry properties is exposed to radiation from tritium, and after the dosimeter has been removed from the source of the radiation, the low energy electron dose deposited in the thin film is determined by radiation-induced, thermally-activated polarization dosimetry techniques.

  4. Polymer film composite transducer

    DOE Patents [OSTI]

    Owen, Thomas E.

    2005-09-20

    A composite piezoelectric transducer, whose piezoeletric element is a "ribbon wound" film of piezolectric material. As the film is excited, it expands and contracts, which results in expansion and contraction of the diameter of the entire ribbon winding. This is accompanied by expansion and contraction of the thickness of the ribbon winding, such that the sound radiating plate may be placed on the side of the winding.

  5. Multifunctional thin film surface

    DOE Patents [OSTI]

    Brozik, Susan M.; Harper, Jason C.; Polsky, Ronen; Wheeler, David R.; Arango, Dulce C.; Dirk, Shawn M.

    2015-10-13

    A thin film with multiple binding functionality can be prepared on an electrode surface via consecutive electroreduction of two or more aryl-onium salts with different functional groups. This versatile and simple method for forming multifunctional surfaces provides an effective means for immobilization of diverse molecules at close proximities. The multifunctional thin film has applications in bioelectronics, molecular electronics, clinical diagnostics, and chemical and biological sensing.

  6. Uranium Oxide as a Highly Reflective Coating from 100-400 eV

    SciTech Connect (OSTI)

    Sandberg, Richard L.; Allred, David D.; Bissell, Luke J.; Johnson, Jed E.; Turley, R. Steven

    2004-05-12

    We present the measured reflectances (Beamline 6.3.2, ALS at LBNL) of naturally oxidized uranium and naturally oxidized nickel thin films from 100-460 eV (2.7 to 11.6 nm) at 5 and 15 degrees grazing incidence. These show that uranium, as UO2, can fulfill its promise as the highest known single surface reflector for this portion of the soft x-ray region, being nearly twice as reflective as nickel in the 124-250 eV (5-10 nm) region. This is due to its large index of refraction coupled with low absorption. Nickel is commonly used in soft x-ray applications in astronomy and synchrotrons. (Its reflectance at 10 deg. exceeds that of Au and Ir for most of this range.) We prepared uranium and nickel thin films via DC-magnetron sputtering of a depleted U target and resistive heating evaporation respectively. Ambient oxidation quickly brought the U sample to UO2 (total thickness about 30 nm). The nickel sample (50 nm) also acquired a thin native oxide coating (<2nm). Though the density of U in UO2 is only half of the metal, its reflectance is high and it is relatively stable against further changes.

  7. Oxidation-resistant reflective surfaces for solar dynamic power generation in near Earth orbit

    SciTech Connect (OSTI)

    Gulino, D.A.; Egger, R.A.; Banholzer, W.F.

    1986-01-01

    Reflective surfaces for space station power generation systems are required to withstand the atomic oxygen-dominated environment of near Earth orbit. Thin films of platinum and rhodium, which are corrosion resistant reflective metals, have been deposited by ion beam sputter deposition onto various substrate materials. Solar reflectances were then measured as a function of time of exposure to a RF-generated air plasma. Similarly, various protective coating materials, including MgF/sub 2/, SiO/sub 2/, Al/sub 2/O/sub 3/, and Si/sub 3/N/sub 4/, were deposited onto silver-coated substrates and then exposed to the plasma. Analysis of the films both before and after exposure by both ESCA and Auger spectroscopy was also performed. The results indicate that Pt and Rh do not suffer any loss in reflectance over the duration of the tests. Also, each of the coating materials survived the plasma environment. The ESCA and Auger analyses are discussed as well.

  8. Identification coding schemes for modulated reflectance systems

    DOE Patents [OSTI]

    Coates, Don M.; Briles, Scott D.; Neagley, Daniel L.; Platts, David; Clark, David D.

    2006-08-22

    An identifying coding apparatus employing modulated reflectance technology involving a base station emitting a RF signal, with a tag, located remotely from the base station, and containing at least one antenna and predetermined other passive circuit components, receiving the RF signal and reflecting back to the base station a modulated signal indicative of characteristics related to the tag.

  9. Synchrotron Infrared Microspectroscopy Study of Film Formation and Breakdown on Copper

    SciTech Connect (OSTI)

    Melendres, C. A.; Hahn, F.

    2010-02-03

    This work demonstrates the utility of synchrotron infrared reflectance microspectroscopy (SIRM), in the far and mid IR, for the determination of the composition of electrogenerated surface films formed during the general and localized corrosion of copper in bicarbonate solution. The back-reflection geometry was used. The anodic passivation film formed on copper at 0.2 V, in 0.01 M NaHCO{sub 3} solution consisted mainly of bicarbonate, copper carbonate dihydroxide or malachite [CuCO{sub 3}.Cu(OH){sub 2}], Cu(OH){sub 2}, and possibly some CuO. At higher potentials, the passive film breaks down and localized corrosion occurs leading to the formation of pits. The composition of the surface films inside the pits formed at 0.6 V was found to be essentially the same as that outside but the relative amount of Cu(OH){sub 2} is higher.

  10. Surface reflectance degradation by microbial communities

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Cheng, Meng -Dawn; Allman, Steve L.; Graham, David E.; Cheng, Karen R.; Pfiffner, Susan Marie; Vishnivetskaya, Tatiana A.; Desjarlais, Andre Omer

    2015-11-05

    Building envelope, such as a roof, is the interface between a building structure and the environment. Understanding of the physics of microbial interactions with the building envelope is limited. In addition to the natural weathering, microorganisms and airborne particulate matter that attach to a cool roof tend to reduce the roof reflectance over time, compromising the energy efficiency advantages of the reflective coating designs. We applied microbial ecology analysis to identify the natural communities present on the exposed coatings and investigated the reduction kinetics of the surface reflectance upon the introduction of a defined mixture of both photoautotrophic and heterotrophicmore » microorganisms representing the natural communities. The result are (1) reflectance degradation by microbial communities follows a first-order kinetic relationship and (2) more than 50% of degradation from the initial reflectance value can be caused by microbial species alone in much less time than 3 years required by the current standard ENERGY STAR® test methods.« less

  11. Surface reflectance degradation by microbial communities

    SciTech Connect (OSTI)

    Cheng, Meng -Dawn; Allman, Steve L.; Graham, David E.; Cheng, Karen R.; Pfiffner, Susan Marie; Vishnivetskaya, Tatiana A.; Desjarlais, Andre Omer

    2015-11-05

    Building envelope, such as a roof, is the interface between a building structure and the environment. Understanding of the physics of microbial interactions with the building envelope is limited. In addition to the natural weathering, microorganisms and airborne particulate matter that attach to a cool roof tend to reduce the roof reflectance over time, compromising the energy efficiency advantages of the reflective coating designs. We applied microbial ecology analysis to identify the natural communities present on the exposed coatings and investigated the reduction kinetics of the surface reflectance upon the introduction of a defined mixture of both photoautotrophic and heterotrophic microorganisms representing the natural communities. The result are (1) reflectance degradation by microbial communities follows a first-order kinetic relationship and (2) more than 50% of degradation from the initial reflectance value can be caused by microbial species alone in much less time than 3 years required by the current standard ENERGY STAR® test methods.

  12. Mesoporous Silica Films with Long-Range Order Prepared from Strongly Segregated Block Copolymer/Homopolymer Blend Templates

    SciTech Connect (OSTI)

    Tirumala, Vijay R.; Pai, Rajaram A.; Agarwal, Sumit; Testa, Jason J.; Bhatnagar, Gaurav; Romang, Alvin H.; Chandler, Curran; Gorman, Brian P.; Jones, Ronald L.; Lin, Eric K.; Watkins, James J.

    2008-06-30

    Well-ordered mesoporous silica films were prepared by infusion and selective condensation of Si alkoxides within preorganized block copolymer/homopolymer blend templates using supercritical CO{sub 2} as the delivery medium. The morphologies of the mesoporous silica films reflect significant improvements in the strength of segregation and long-range order of template blends of poly(ethylene oxide-b-propylene oxide-b-ethylene oxide) triblock copolymers with selectively associating homopolymers such as poly(acrylic acid) or poly(4-hydroxystyrene) prior as compared to templates comprised of the neat copolymer. Control over film porosity, pore ordering, and morphology of the films is achieved through simple variations in the homopolymer concentration. The films were characterized using X-ray reflectivity, small-angle X-ray scattering, and transmission electron microscopy.

  13. Epitaxial thin films

    DOE Patents [OSTI]

    Hunt, Andrew Tye; Deshpande, Girish; Lin, Wen-Yi; Jan, Tzyy-Jiuan

    2006-04-25

    Epitatial thin films for use as buffer layers for high temperature superconductors, electrolytes in solid oxide fuel cells (SOFC), gas separation membranes or dielectric material in electronic devices, are disclosed. By using CCVD, CACVD or any other suitable deposition process, epitaxial films having pore-free, ideal grain boundaries, and dense structure can be formed. Several different types of materials are disclosed for use as buffer layers in high temperature superconductors. In addition, the use of epitaxial thin films for electrolytes and electrode formation in SOFCs results in densification for pore-free and ideal gain boundary/interface microstructure. Gas separation membranes for the production of oxygen and hydrogen are also disclosed. These semipermeable membranes are formed by high-quality, dense, gas-tight, pinhole free sub-micro scale layers of mixed-conducting oxides on porous ceramic substrates. Epitaxial thin films as dielectric material in capacitors are also taught herein. Capacitors are utilized according to their capacitance values which are dependent on their physical structure and dielectric permittivity. The epitaxial thin films of the current invention form low-loss dielectric layers with extremely high permittivity. This high permittivity allows for the formation of capacitors that can have their capacitance adjusted by applying a DC bias between their electrodes.

  14. Thin films and uses

    DOE Patents [OSTI]

    Baskaran, Suresh; Graff, Gordon L.; Song, Lin

    1998-01-01

    The invention provides a method for synthesizing a titanium oxide-containing film comprising the following steps: (a) preparing an aqueous solution of a titanium chelate with a titanium molarity in the range of 0.01M to 0.6M. (b) immersing a substrate in the prepared solution, (c) decomposing the titanium chelate to deposit a film on the substrate. The titanium chelate maybe decomposed acid, base, temperature or other means. A preferred method provides for the deposit of adherent titanium oxide films from C2 to C5 hydroxy carboxylic acids. In another aspect the invention is a novel article of manufacture having a titanium coating which protects the substrate against ultraviolet damage. In another aspect the invention provides novel semipermeable gas separation membranes, and a method for producing them.

  15. Thin film photovoltaic device

    DOE Patents [OSTI]

    Catalano, Anthony W.; Bhushan, Manjul

    1982-01-01

    A thin film photovoltaic solar cell which utilizes a zinc phosphide semiconductor is of the homojunction type comprising an n-type conductivity region forming an electrical junction with a p-type region, both regions consisting essentially of the same semiconductor material. The n-type region is formed by treating zinc phosphide with an extrinsic dopant such as magnesium. The semiconductor is formed on a multilayer substrate which acts as an opaque contact. Various transparent contacts may be used, including a thin metal film of the same chemical composition as the n-type dopant or conductive oxides or metal grids.

  16. Thin film photovoltaic device

    DOE Patents [OSTI]

    Catalano, A.W.; Bhushan, M.

    1982-08-03

    A thin film photovoltaic solar cell which utilizes a zinc phosphide semiconductor is of the homojunction type comprising an n-type conductivity region forming an electrical junction with a p-type region, both regions consisting essentially of the same semiconductor material. The n-type region is formed by treating zinc phosphide with an extrinsic dopant such as magnesium. The semiconductor is formed on a multilayer substrate which acts as an opaque contact. Various transparent contacts may be used, including a thin metal film of the same chemical composition as the n-type dopant or conductive oxides or metal grids. 5 figs.

  17. Parasitic oscillation suppression in solid state lasers using absorbing thin films

    DOE Patents [OSTI]

    Zapata, Luis E.

    1994-01-01

    A thin absorbing film is bonded onto at least certain surfaces of a solid state laser gain medium. An absorbing metal-dielectric multilayer film is optimized for a broad range of incidence angles, and is resistant to the corrosive/erosive effects of a coolant such as water, used in the forced convection cooling of the film. Parasitic oscillations hamper the operation of solid state lasers by causing the decay of stored energy to amplified rays trapped within the gain medium by total and partial internal reflections off the gain medium facets. Zigzag lasers intended for high average power operation require the ASE absorber.

  18. Parasitic oscillation suppression in solid state lasers using absorbing thin films

    DOE Patents [OSTI]

    Zapata, L.E.

    1994-08-02

    A thin absorbing film is bonded onto at least certain surfaces of a solid state laser gain medium. An absorbing metal-dielectric multilayer film is optimized for a broad range of incidence angles, and is resistant to the corrosive/erosive effects of a coolant such as water, used in the forced convection cooling of the film. Parasitic oscillations hamper the operation of solid state lasers by causing the decay of stored energy to amplified rays trapped within the gain medium by total and partial internal reflections off the gain medium facets. Zigzag lasers intended for high average power operation require the ASE absorber. 16 figs.

  19. Measuring Photochemical Kinetics in Submonolayer Films by Transient ATR Spectroscopy on a Multimode Planar Waveguide

    SciTech Connect (OSTI)

    Simon, Anne M.; Marucci, Nicole E.; Saavedra, S. Scott

    2011-07-15

    Understanding the kinetics of reactions in molecular thin films can aid in the molecular engineering of organic photovoltaics and biosensors. Using two analytical methods, transient absorbance spectroscopy (TAS) and attenuated total reflectance (ATR), in a relatively simple arrangement when compared with previous TAS/ATR instruments to interrogate molecular structure and photochemistry at interfaces. The multimode planar waveguide geometry provides a significant path length enhancement relative to a conventional transmission geometry, making it feasible to perform measurements on low-surface-coverage films. This work demonstrates that TAS/ATR can be used to probe structure and photochemical kinetics in molecular films at extremely low surface coverages.

  20. NMR characterization of thin films

    DOE Patents [OSTI]

    Gerald, II, Rex E.; Klingler, Robert J.; Rathke, Jerome W.; Diaz, Rocio; Vukovic, Lela

    2008-11-25

    A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.

  1. NMR characterization of thin films

    DOE Patents [OSTI]

    Gerald II, Rex E.; Klingler, Robert J.; Rathke, Jerome W.; Diaz, Rocio; Vukovic, Lela

    2010-06-15

    A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.

  2. Bidirectional reflection functions from surface bump maps

    SciTech Connect (OSTI)

    Cabral, B.; Max, N.; Springmeyer, R.

    1987-04-29

    The Torrance-Sparrow model for calculating bidirectional reflection functions contains a geometrical attenuation factor to account for shadowing and occlusions in a hypothetical distribution of grooves on a rough surface. Using an efficient table-based method for determining the shadows and occlusions, we calculate the geometric attenuation factor for surfaces defined by a specific table of bump heights. Diffuse and glossy specular reflection of the environment can be handled in a unified manner by using an integral of the bidirectional reflection function times the environmental illumination, over the hemisphere of solid angle above a surface. We present a method of estimating the integral, by expanding the bidirectional reflection coefficient in spherical harmonics, and show how the coefficients in this expansion can be determined efficiently by reorganizing our geometric attenuation calculation.

  3. Frustrated total internal reflection acoustic field sensor

    DOE Patents [OSTI]

    Kallman, Jeffrey S.

    2000-01-01

    A frustrated total internal reflection acoustic field sensor which allows the acquisition of the acoustic field over an entire plane, all at once. The sensor finds use in acoustic holography and acoustic diffraction tomography. For example, the sensor may be produced by a transparent plate with transparent support members tall enough to support one or more flexible membranes at an appropriate height for frustrated total internal reflection to occur. An acoustic wave causes the membrane to deflect away from its quiescent position and thus changes the amount of light that tunnels through the gap formed by the support members and into the membrane, and so changes the amount of light reflected by the membrane. The sensor(s) is illuminated by a uniform tight field, and the reflection from the sensor yields acoustic wave amplitude and phase information which can be picked up electronically or otherwise.

  4. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    the sample in a manner consistent with either technique has prevented the use of coherent imaging techniques with reflective samples. Researchers working at Beamline 12.0.2 have...

  5. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Imaging in Reflection Print The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs...

  6. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lensless X-Ray Imaging in Reflection Print The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless...

  7. Preparing reflective substrate surfaces for laser treatment

    DOE Patents [OSTI]

    Flick, F.F.

    1984-11-21

    A coating of either copper oxide or felt tip pen ink is used on reflective copper or gold substrates to enhance laser beam coupling when the substrates are cut or welded with a laser.

  8. Reflectance thermometry in dynamic compression experiments. (Conference) |

    Office of Scientific and Technical Information (OSTI)

    SciTech Connect Reflectance thermometry in dynamic compression experiments. Citation Details In-Document Search Title: Reflectance thermometry in dynamic compression experiments. Abstract not provided. Authors: Dolan, Daniel H., ; Ao, Tommy ; Seagle, Christopher T Publication Date: 2012-02-01 OSTI Identifier: 1118217 Report Number(s): SAND2012-0864C 481321 DOE Contract Number: AC04-94AL85000 Resource Type: Conference Resource Relation: Conference: 9th International Temperature Symposium held

  9. Lamp method and apparatus using multiple reflections

    DOE Patents [OSTI]

    MacLennan, Donald A.; Turner, Brian; Kipling, Kent

    1999-01-01

    A method wherein the light in a sulfur or selenium lamp is reflected through the fill a multiplicity of times to convert ultraviolet radiation to visible. A light emitting device comprised of an electrodeless envelope which bears a light reflecting covering around a first portion which does not crack due to differential thermal expansion and which has a second portion which comprises a light transmissive aperture.

  10. Lamp method and apparatus using multiple reflections

    DOE Patents [OSTI]

    MacLennan, D.A.; Turner, B.; Kipling, K.

    1999-05-11

    A method wherein the light in a sulfur or selenium lamp is reflected through the fill a multiplicity of times to convert ultraviolet radiation to visible is disclosed. A light emitting device comprised of an electrodeless envelope which bears a light reflecting covering around a first portion which does not crack due to differential thermal expansion and which has a second portion which comprises a light transmissive aperture. 20 figs.

  11. Methods for producing complex films, and films produced thereby

    DOE Patents [OSTI]

    Duty, Chad E.; Bennett, Charlee J. C.; Moon, Ji -Won; Phelps, Tommy J.; Blue, Craig A.; Dai, Quanqin; Hu, Michael Z.; Ivanov, Ilia N.; Jellison, Jr., Gerald E.; Love, Lonnie J.; Ott, Ronald D.; Parish, Chad M.; Walker, Steven

    2015-11-24

    A method for producing a film, the method comprising melting a layer of precursor particles on a substrate until at least a portion of the melted particles are planarized and merged to produce the film. The invention is also directed to a method for producing a photovoltaic film, the method comprising depositing particles having a photovoltaic or other property onto a substrate, and affixing the particles to the substrate, wherein the particles may or may not be subsequently melted. Also described herein are films produced by these methods, methods for producing a patterned film on a substrate, and methods for producing a multilayer structure.

  12. Origin of deep crustal reflections: Implications of coincident seismic refraction and reflection data in Nevada

    SciTech Connect (OSTI)

    Holbrook, W.S. (Woods Hole Oceanographic Institution, MA (USA)); Catchings, R.D. (U.S. Geological Survey, Menlo Park, CA (USA)); Jarchow, C.M. (Stanford Univ., CA (USA))

    1991-02-01

    The authors compare seismic refraction and reflection results along the PASSCAL/COCORP 40{degree}N transect in the northern Basin and Range of Nevada in order to determine the origin of the prominent reflections from the deep crystalline crust. Reflection data along the transect show a thick zone of discontinuous, subhorizontal reflections, beginning at 4-6 s two-way traveltime (10-20 km depth) and ending at 9-11 s (27-35 km). Two independently derived velocity models, based on refraction data, are largely similar and agree on many important aspects of the reflectivity-velocity relation. Both models show that the top of the reflective zone lies 3-8 km above a prominent mid-crustal velocity discontinuity, which is interpreted to separate bulk silicic from bulk dioritic-gabbroic crust; in most places, the silicic mid-crust is more strongly reflective than the mafic lower crust. This pattern is expected in areas where ductile shearing is the mechanism responsible for the reflectivity. One of the velocity models, however, suggests that, in places, the strongest reflectivity spans both the middle (6.1-6.3 km/s) and lower (6.6 km/s) crust; this pattern suggests that the combined influence of ductile strain fabrics and mafic intrusions gives rise to crustal reflections. Both models show that the lowermost crust and crust/mantle transition are highly reflective, also suggesting the presence of mafic and/or ultramafic intrusions. Thus the observed reflection patterns suggest that ductile shearing and the intrusion of mantle-derived magma - both of which are likely to have accompanied the extreme Cenozoic extension - are important factors in generating deep crustal reflections.

  13. Thin film photovoltaic cell

    DOE Patents [OSTI]

    Meakin, John D.; Bragagnolo, Julio

    1982-01-01

    A thin film photovoltaic cell having a transparent electrical contact and an opaque electrical contact with a pair of semiconductors therebetween includes utilizing one of the electrical contacts as a substrate and wherein the inner surface thereof is modified by microroughening while being macro-planar.

  14. Dynamics of helium films

    SciTech Connect (OSTI)

    Clements, B.E.; Epstein, J.L.; Krotscheck, E.; Tymczak, C.J.; Saarela, M.

    1992-11-01

    The authors present quantitative calculations for the static structure and the dynamics of quantum liquid films on a translationally invariant substrate. The excitation spectrum is calculated by solving the equations of motion for time-dependent one- and two-body densities. They find significant corrections to the Feynman spectrum for the phonon-like collective excitations. 8 refs., 2 figs.

  15. Orientation filtering for crystalline films

    DOE Patents [OSTI]

    Smith, Henry I.; Atwater, Harry A.; Thompson, Carl V.; Geis, Michael W.

    1986-12-30

    A substrate is coated with a film to be recrystallized. A pattern of crystallization barriers is created in the film, for example, by etching voids in the film. An encapsulation layer is generally applied to protect the film, fill the voids and otherwise enhance a recrystallization process. Recrystallization is carried out such that certain orientations pass preferentially through the barrier, generally as a result of growth-velocity anisotropy. The result is a film of a specific predetermined crystallographic orientation, a range of orientations or a set of discrete orientations.

  16. Orientation filtering for crystalline films

    DOE Patents [OSTI]

    Smith, H.I.; Atwater, H.A.; Thompson, C.V.; Geis, M.W.

    1986-12-30

    A substrate is coated with a film to be recrystallized. A pattern of crystallization barriers is created in the film, for example, by etching voids in the film. An encapsulation layer is generally applied to protect the film, fill the voids and otherwise enhance a recrystallization process. Recrystallization is carried out such that certain orientations pass preferentially through the barrier, generally as a result of growth-velocity anisotropy. The result is a film of a specific predetermined crystallographic orientation, a range of orientations or a set of discrete orientations. 7 figs.

  17. DOE - NNSA/NFO -- Films

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Films NNSA/NFO Language Options U.S. DOE/NNSA - Nevada Field Office Nevada Field Office Current Film Library A large number of films depicting historical as well as current activities of the Nevada National Security Site are available to the public on our YouTube page. Historical Nuclear Weapons Test Films The Department of Energy, in cooperation with the Department of Defense, declassified a series of historical films on the nuclear weapons program. They were converted to videotape format to

  18. Calibration of bremsstrahlung prefogged Kodak RAR 2492 film

    SciTech Connect (OSTI)

    Gorzen, D.F.; Armentrout, C.; Burek, A.; Bird, R.; Geddes, J.; Gerber, G. ); Rockett, P.D. )

    1990-10-01

    High-energy background radiation from PBFA II at Sandia National Laboratory introduces uncertainty regarding the effect of background fogging on the sensitivity of the x-ray film at soft x-ray energies. We have performed a calibration to determine how the sensitivity of the Kodak RAR 2492 film is affected by high-energy background radiation. To simulate the background radiation the film was fogged to various densities using a 10 keV bremsstrahlung spectrum. The film was then exposed to soft x-ray emission lines of Al {ital K}{alpha} and Ti {ital K}{alpha} selected by Bragg reflection from an electron bombardment source. The intensity of the x-ray flux was continuously monitored with a Si(Li) detector to eliminate error due to drift of the x-ray source's intensity. A microdensitometer with matched objectives was used to find the specular density of the exposed film. The results of the calibration are presented in the form of {ital D} vs log {ital l} for the various densities of the bremmstrahlung prefog exposures.

  19. REFLECT: A computer program for the x-ray reflectivity of bent perfect crystals

    SciTech Connect (OSTI)

    Etelaeniemi, V.; Suortti, P.; Thomlinson, W. . Dept. of Physics; Brookhaven National Lab., Upton, NY )

    1989-09-01

    The design of monochromators for x-ray applications, using either standard laboratory sources on synchrotron radiation sources, requires a knowledge of the reflectivity of the crystals. The reflectivity depends on the crystals used, the geometry of the reflection, the energy range of the radiation, and, in the present case, the cylindrical bending radius of the optical device. This report is intended to allow the reader to become familiar with, and therefore use, a computer program called REFLECT which we have used in the design of a dual beam Laue monochromator for synchrotron angiography. The results of REFLECT have been compared to measured reflectivities for both bent Bragg and Laue geometries. The results are excellent and should give full confidence in the use of the program. 6 refs.

  20. High reflectance-low stress Mo-Si multilayer reflective coatings

    DOE Patents [OSTI]

    Montcalm, Claude; Mirkarimi, Paul B.

    2000-01-01

    A high reflectance-low stress Mo-Si multilayer reflective coating particularly useful for the extreme ultraviolet (EUV) wavelength region. While the multilayer reflective coating has particular application for EUV lithography, it has numerous other applications where high reflectance and low stress multilayer coatings are utilized. Multilayer coatings having high near-normal incidence reflectance (R.gtoreq.65%) and low residual stress (.ltoreq.100 MPa) have been produced using thermal and non-thermal approaches. The thermal approach involves heating the multilayer coating to a given temperature for a given time after deposition in order to induce structural changes in the multilayer coating that will have an overall "relaxation" effect without reducing the reflectance significantly.

  1. Process for fabricating high reflectance-low stress Mo--Si multilayer reflective coatings

    DOE Patents [OSTI]

    Montcalm, Claude; Mirkarimi, Paul B.

    2001-01-01

    A high reflectance-low stress Mo--Si multilayer reflective coating particularly useful for the extreme ultraviolet (EUV) wavelength region. While the multilayer reflective coating has particular application for EUV lithography, it has numerous other applications where high reflectance and low stress multilayer coatings are utilized. Multilayer coatings having high near-normal incidence reflectance (R.gtoreq.65%) and low residual stress (.ltoreq.100 MPa) have been produced using thermal and non-thermal approaches. The thermal approach involves heating the multilayer coating to a given temperature for a given time after deposition in order to induce structural changes in the multilayer coating that will have an overall "relaxation" effect without reducing the reflectance significantly.

  2. Method for making carbon films

    DOE Patents [OSTI]

    Tan, Ming X.

    1999-01-01

    A method for treating an organic polymer material, preferably a vinylidene chloride/vinyl chloride copolymer (Saran) to produce a flat sheet of carbon film material having a high surface area (.apprxeq.1000 m.sup.2 /g) suitable as an electrode material for super capacitor applications. The method comprises heating a vinylidene chloride/vinyl chloride copolymer film disposed between two spaced apart graphite or ceramic plates to a first temperature of about 160.degree. C. for about 14 hours to form a stabilized vinylidene chloride/vinyl chloride polymer film, thereafter heating the stabilized film to a second temperature of about 750.degree. C. in an inert atmosphere for about one hour to form a carbon film; and finally activating the carbon film to increase the surface area by heating the carbon film in an oxidizing atmosphere to a temperature of at least 750-850.degree. C. for between 1-6 hours.

  3. Method for making carbon films

    DOE Patents [OSTI]

    Tan, M.X.

    1999-07-29

    A method for treating an organic polymer material, preferably a vinylidene chloride/vinyl chloride copolymer (Saran) to produce a flat sheet of carbon film material having a high surface area ([approx equal]1000 m[sup 2] /g) suitable as an electrode material for super capacitor applications. The method comprises heating a vinylidene chloride/vinyl chloride copolymer film disposed between two spaced apart graphite or ceramic plates to a first temperature of about 160 C for about 14 hours to form a stabilized vinylidene chloride/vinyl chloride polymer film, thereafter heating the stabilized film to a second temperature of about 750 C in an inert atmosphere for about one hour to form a carbon film; and finally activating the carbon film to increase the surface area by heating the carbon film in an oxidizing atmosphere to a temperature of at least 750--850 C for between 1--6 hours. 2 figs.

  4. Thin film superconductor magnetic bearings

    DOE Patents [OSTI]

    Weinberger, Bernard R.

    1995-12-26

    A superconductor magnetic bearing includes a shaft (10) that is subject to a load (L) and rotatable around an axis of rotation, a magnet (12) mounted to the shaft, and a stator (14) in proximity to the shaft. The stator (14) has a superconductor thin film assembly (16) positioned to interact with the magnet (12) to produce a levitation force on the shaft (10) that supports the load (L). The thin film assembly (16) includes at least two superconductor thin films (18) and at least one substrate (20). Each thin film (18) is positioned on a substrate (20) and all the thin films are positioned such that an applied magnetic field from the magnet (12) passes through all the thin films. A similar bearing in which the thin film assembly (16) is mounted on the shaft (10) and the magnet (12) is part of the stator (14) also can be constructed.

  5. Low reflectance high power RF load

    DOE Patents [OSTI]

    Ives, R. Lawrence; Mizuhara, Yosuke M.

    2016-02-02

    A load for traveling microwave energy has an absorptive volume defined by cylindrical body enclosed by a first end cap and a second end cap. The first end cap has an aperture for the passage of an input waveguide with a rotating part that is coupled to a reflective mirror. The inner surfaces of the absorptive volume consist of a resistive material or are coated with a coating which absorbs a fraction of incident RF energy, and the remainder of the RF energy reflects. The angle of the reflector and end caps is selected such that reflected RF energy dissipates an increasing percentage of the remaining RF energy at each reflection, and the reflected RF energy which returns to the rotating mirror is directed to the back surface of the rotating reflector, and is not coupled to the input waveguide. Additionally, the reflector may have a surface which generates a more uniform power distribution function axially and laterally, to increase the power handling capability of the RF load. The input waveguide may be corrugated for HE11 mode input energy.

  6. Pigments which reflect infrared radiation from fire

    DOE Patents [OSTI]

    Berdahl, P.H.

    1998-09-22

    Conventional paints transmit or absorb most of the intense infrared (IR) radiation emitted by fire, causing them to contribute to the spread of fire. The present invention comprises a fire retardant paint additive that reflects the thermal IR radiation emitted by fire in the 1 to 20 micrometer ({micro}m) wavelength range. The important spectral ranges for fire control are typically about 1 to about 8 {micro}m or, for cool smoky fires, about 2 {micro}m to about 16 {micro}m. The improved inventive coatings reflect adverse electromagnetic energy and slow the spread of fire. Specific IR reflective pigments include titanium dioxide (rutile) and red iron oxide pigments with diameters of about 1 {micro}m to about 2 {micro}m and thin leafing aluminum flake pigments. 4 figs.

  7. Pigments which reflect infrared radiation from fire

    DOE Patents [OSTI]

    Berdahl, Paul H.

    1998-01-01

    Conventional paints transmit or absorb most of the intense infrared (IR) radiation emitted by fire, causing them to contribute to the spread of fire. The present invention comprises a fire retardant paint additive that reflects the thermal IR radiation emitted by fire in the 1 to 20 micrometer (.mu.m) wavelength range. The important spectral ranges for fire control are typically about 1 to about 8 .mu.m or, for cool smoky fires, about 2 .mu.m to about 16 .mu.m. The improved inventive coatings reflect adverse electromagnetic energy and slow the spread of fire. Specific IR reflective pigments include titanium dioxide (rutile) and red iron oxide pigments with diameters of about 1 .mu.m to about 2 .mu.m and thin leafing aluminum flake pigments.

  8. Reflection technique for thermal mapping of semiconductors

    DOE Patents [OSTI]

    Walter, Martin J.

    1989-06-20

    Semiconductors may be optically tested for their temperatures by illuminating them with tunable monochromatic electromagnetic radiation and observing the light reflected off of them. A transition point will occur when the wavelength of the light corresponds with the actual band gap energy of the semiconductor. At the transition point, the image of the semiconductor will appreciably darken as the light is transmitted through it, rather than being reflected off of it. The wavelength of the light at the transition point corresponds to the actual band gap energy and the actual temperature of the semiconductor.

  9. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lensless X-Ray Imaging in Reflection Lensless X-Ray Imaging in Reflection Print Wednesday, 26 October 2011 00:00 The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs combine the advantages of sychrotron light sources (high brightness and x-ray wavelengths relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are

  10. Prisms with total internal reflection as solar reflectors

    DOE Patents [OSTI]

    Rabl, Arnulf; Rabl, Veronika

    1978-01-01

    An improved reflective wall for radiant energy collection and concentration devices is provided. The wall is comprised of a plurality of prisms whose frontal faces are adjacent and which reflect the desired radiation by total internal reflection.

  11. Thin film composite electrolyte

    DOE Patents [OSTI]

    Schucker, Robert C. (The Woodlands, TX)

    2007-08-14

    The invention is a thin film composite solid (and a means for making such) suitable for use as an electrolyte, having a first layer of a dense, non-porous conductive material; a second layer of a porous ionic conductive material; and a third layer of a dense non-porous conductive material, wherein the second layer has a Coefficient of thermal expansion within 5% of the coefficient of thermal expansion of the first and third layers.

  12. Total internal reflection laser tools and methods

    DOE Patents [OSTI]

    Zediker, Mark S.; Faircloth, Brian O.; Kolachalam, Sharath K.; Grubb, Daryl L.

    2016-02-02

    There is provided high power laser tools and laser heads that utilize total internal reflection ("TIR") structures to direct the laser beam along a laser beam path within the TIR structure. The TIR structures may be a TIR prism having its hypotenuse as a TIR surface.

  13. Multi-reflective acoustic wave device

    DOE Patents [OSTI]

    Andle, Jeffrey C.

    2006-02-21

    An acoustic wave device, which utilizes multiple localized reflections of acoustic wave for achieving an infinite impulse response while maintaining high tolerance for dampening effects, is disclosed. The device utilized a plurality of electromechanically significant electrodes disposed on most of the active surface. A plurality of sensors utilizing the disclosed acoustic wave mode device are also described.

  14. Sandia Energy - Improved Method to Measure Glare and Reflected...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    and more accurate method of measuring the irradiance from solar reflections using a digital camera. Measurements of reflected solar irradiance is of great importance to...

  15. Procedure for measuring the solar reflectance of flat or curved...

    Office of Scientific and Technical Information (OSTI)

    Procedure for measuring the solar reflectance of flat or curved roofing assemblies Citation Details In-Document Search Title: Procedure for measuring the solar reflectance of flat ...

  16. Measuring solar reflectance Part II: Review of practical methods...

    Office of Scientific and Technical Information (OSTI)

    Citation Details In-Document Search Title: Measuring solar reflectance Part II: Review of ... A companion article explored how solar reflectance varies with surface orientation and ...

  17. Reflection of a TE-polarised Gaussian beam from a layered structure under conditions of resonance excitation of waveguide modes

    SciTech Connect (OSTI)

    Sokolov, V I; Marusin, N V; Molchanova, S I; Savelyev, A G; Khaydukov, E V; Panchenko, V Ya

    2014-11-30

    The problem of reflection of a TE-polarised Gaussian light beam from a layered structure under conditions of resonance excitation of waveguide modes using a total internal reflection prism is considered. Using the spectral approach we have derived the analytic expressions for the mode propagation lengths, widths and depths of m-lines (sharp and narrow dips in the angular dependence of the specular reflection coefficient), depending on the structure parameters. It is shown that in the case of weak coupling, when the propagation lengths l{sub m} of the waveguide modes are mainly determined by the extinction coefficient in the film, the depth of m-lines grows with the mode number m. In the case of strong coupling, when l{sub m} is determined mainly by the radiation of modes into the prism, the depth of m-lines decreases with increasing m. The change in the TE-polarised Gaussian beam shape after its reflection from the layered structure is studied, which is determined by the energy transfer from the incident beam into waveguide modes that propagate along the structure by the distance l{sub m}, are radiated in the direction of specular reflection and interfere with a part of the beam reflected from the working face of the prism. It is shown that this interference can lead to the field intensity oscillations near m-lines. The analysis of different methods for determining the parameters of thin-film structures is presented, including the measurement of mode angles θ{sub m} and the reflected beam shape. The methods are based on simultaneous excitation of a few waveguide modes in the film with a strongly focused monochromatic Gaussian beam, the waist width of which is much smaller than the propagation length of the modes. As an example of using these methods, the refractive index and the thickness of silicon monoxide film on silica substrate at the wavelength 633 nm are determined. (fibre and integrated-optical structures)

  18. Photovoltaic Films - Energy Innovation Portal

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Solar Photovoltaic Solar Photovoltaic Find More Like This Return to Search Photovoltaic Films Los Alamos National Laboratory Contact LANL About This Technology LANL&rsquo;s solar power portfolio includes a deposition process known as PAD. PAD eliminates the need for vacuum-based thin film equipment. LANL's solar power portfolio includes a deposition process known as PAD. PAD eliminates the need for vacuum-based thin film equipment. Technology Marketing SummaryThe rising total cost of energy

  19. Frequency mixer having ferromagnetic film

    DOE Patents [OSTI]

    Khitun, Alexander; Roshchin, Igor V.; Galatsis, Kosmas; Bao, Mingqiang; Wang, Kang L.

    2016-03-29

    A frequency conversion device, which may include a radiofrequency (RF) mixer device, includes a substrate and a ferromagnetic film disposed over a surface of the substrate. An insulator is disposed over the ferromagnetic film and at least one microstrip antenna is disposed over the insulator. The ferromagnetic film provides a non-linear response to the frequency conversion device. The frequency conversion device may be used for signal mixing and amplification. The frequency conversion device may also be used in data encryption applications.

  20. Introduction to BPA Film Collection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    of Information Act Investor Relations Library Privacy Publications Tribal Affairs Introduction to BPA Film Collection: Volume One, Disc One, 1939-1954 An error occurred. Try...

  1. DOE - NNSA/NFO -- Current Films

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Films > Current Nevada Field Office Film Library Instructions: Click the Windows Media or MPG Movie link to view the video Film details are listed on the right Refer to the Viewing Instructions

  2. Characterization of background reflectivity for MEDUSA

    SciTech Connect (OSTI)

    Oldenborg, R. C.; Tiee, J. J.; Foy, B. R.; Petrin, R. R.; Wilson, C. W.

    2003-01-01

    The DARPA MEDUSA program goal is to detect, locate, and identify electro-optical threats in the vicinity of a moving platform. Laser sensing will be employed to find these threats by looking for anomalous reflections from threat sensors. However, the reflectivity variability (clutter) in both natural and manmade backgrounds will inherently limit target detection levels. In parallel with advanced component development by several aerospace contractors, a study of this clutter limitation was initiated in the long-wave (LW) and midwave (MW) infrared spectral regions to properly drive system design parameters. The analysis of clutter and associated limits on detection has been a major component of LANL efforts in laser remote sensing for non-proliferation. LANL is now analyzing existing data and conducting additional selected measurements in both the LWIR (9 and 10.6 pm) and MWIR (4.6 pm) in support of the DARPA program to increase our understanding of these clutter limitations and, thereby aid in the design and development of the MEDUSA system. The status of the LANL effort will be discussed. A variety of different natural and manmade target types have been investigated. Target scenes range from relatively low clutter sites typical of a southwestern desert to higher clutter downtown urban sites. Images are created by conducting raster scans across a scene interest. These images are then analyzed using data clustering techniques (e g K-means) to identify regions within the scene that contain similar reflectivity profiles. Data will be presented illustrating the reflectivity variability among different samples of the same target type, Le. within the same cluster, and among different data clusters. In general, it is found that the variability of reflectivities among similar targets is well represented by a log-normal distribution. Furthermore, manmade target tend to have higher reflectivities and more variability than natural targets. The implications of this observation for MEDUSA systems designed to locate and identify threat sensors will be discussed. The implications for chemical sensing applications will also be addressed.

  3. Catheter based mid-infrared reflectance and reflectance generated absorption spectroscopy

    DOE Patents [OSTI]

    Holman, Hoi-Ying N

    2013-10-29

    A method of characterizing conditions in a tissue, by (a) providing a catheter that has a light source that emits light in selected wavenumbers within the range of mid-IR spectrum; (b) directing the light from the catheter to an area of tissue at a location inside a blood vessel of a subject; (c) collecting light reflected from the location and generating a reflectance spectra; and (d) comparing the reflectance spectra to a reference spectra of normal tissue, whereby a location having an increased number of absorbance peaks at said selected wavenumbers indicates a tissue inside the blood vessel containing a physiological marker for atherosclerosis.

  4. DOE - NNSA/NFO -- Historical Test Films

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Films > Historical Test Films NNSA/NFO Language Options U.S. DOE/NNSA - Nevada Field Office Historical Test Films Instructions: Click the document Title or Thumbnail to view the video clip and film details Click the Number, Title, or Date table header links to sort the information. The default sort is by Number Complete the Historical Test Film Order Form to order Historical Test films Number Title Date Pic 800000 Nuclear Testing Review - ABLE Various Dates

  5. Low-temperature electrical transport in B-doped ultrananocrystalline diamond film

    SciTech Connect (OSTI)

    Li, Lin; Zhao, Jing; Hu, Zhaosheng; Quan, Baogang; Li, Junjie Gu, Changzhi

    2014-05-05

    B-doped ultrananocrystalline diamond (UNCD) films are grown using hot-filament chemical vapor deposition method, and their electrical transport properties varying with temperature are investigated. When the B-doped concentration of UNCD film is low, a step-like increase feature of the resistance is observed with decreasing temperature, reflecting at least three temperature-modified electronic state densities at the Fermi level according to three-dimensional Mott's variable range hopping transport mechanism, which is very different from that of reported B-doped nanodiamond. With increasing B-doped concentration, a superconductive transformation occurs in the UNCD film and the highest transformation temperature of 5.3?K is observed, which is higher than that reported for superconducting nanodiamond films. In addition, the superconducting coherence length is about 0.63?nm, which breaks a reported theoretical and experimental prediction about ultra-nanoscale diamond's superconductivity.

  6. Magnetron sputtered boron films for increasing hardness of a metal surface

    DOE Patents [OSTI]

    Makowiecki, Daniel M.; Jankowski, Alan F.

    2003-05-27

    A method is described for the production of thin boron and titanium/boron films by magnetron sputter deposition. The amorphous boron films contain no morphological growth features, unlike those found when thin films are prepared by various physical vapor deposition processes. Magnetron sputter deposition method requires the use of a high density crystalline boron sputter target which is prepared by hot isostatic pressing. Thin boron films prepared by this method are useful for producing hardened surfaces, surfacing machine tools, etc. and for ultra-thin band pass filters as well as the low Z element in low Z/high Z optical components, such as mirrors which enhance reflectivity from grazing to normal incidence.

  7. Size-effects on the optical properties of zirconium oxide thin films

    SciTech Connect (OSTI)

    Ramana, C. V.; Vemuri, R. S.; Fernandez, I.; Campbell, A. L.

    2009-12-07

    Zirconium oxide (ZrO{sub 2}) thin films with an average crystallite-size (L) ranging from 5 to 25 nm were grown by sputter deposition onto optical grade quartz substrates. The optical properties of grown ZrO{sub 2} films were evaluated using optical transmission and reflectance spectroscopic measurements. The size-effects were significant on the optical characteristics of ZrO{sub 2} films. The bandgap energy (E{sub g}) was found to increase from 5.78 to 6.07 eV with decreasing L values from 20 to 7 nm. A direct, linear inverse L-E{sub g} relationship found for ZrO{sub 2} films suggest that tuning optical properties for desired applications can be achieved by controlling the size.

  8. Thin film hydrogen sensor

    DOE Patents [OSTI]

    Lauf, Robert J.; Hoffheins, Barbara S.; Fleming, Pamela H.

    1994-01-01

    A hydrogen sensor element comprises an essentially inert, electrically-insulating substrate having a thin-film metallization deposited thereon which forms at least two resistors on the substrate. The metallization comprises a layer of Pd or a Pd alloy for sensing hydrogen and an underlying intermediate metal layer for providing enhanced adhesion of the metallization to the substrate. An essentially inert, electrically insulating, hydrogen impermeable passivation layer covers at least one of the resistors, and at least one of the resistors is left uncovered. The difference in electrical resistances of the covered resistor and the uncovered resistor is related to hydrogen concentration in a gas to which the sensor element is exposed.

  9. Method for producing highly reflective metal surfaces

    DOE Patents [OSTI]

    Arnold, J.B.; Steger, P.J.; Wright, R.R.

    1982-03-04

    The invention is a novel method for producing mirror surfaces which are extremely smooth and which have high optical reflectivity. The method includes depositing, by electrolysis, an amorphous layer of nickel on an article and then diamond-machining the resulting nickel surface to increase its smoothness and reflectivity. The machined nickel surface then is passivated with respect to the formation of bonds with electrodeposited nickel. Nickel then is electrodeposited on the passivated surface to form a layer of electroplated nickel whose inside surface is a replica of the passivated surface. The mandrel then may be-re-passivated and provided with a layer of electrodeposited nickel, which is then recovered from the mandrel providing a second replica. The mandrel can be so re-used to provide many such replicas. As compared with producing each mirror-finished article by plating and diamond-machining, the new method is faster and less expensive.

  10. Compact reflective imaging spectrometer utilizing immersed gratings

    DOE Patents [OSTI]

    Chrisp, Michael P. (Danville, CA)

    2006-05-09

    A compact imaging spectrometer comprising an entrance slit for directing light, a first mirror that receives said light and reflects said light, an immersive diffraction grating that diffracts said light, a second mirror that focuses said light, and a detector array that receives said focused light. The compact imaging spectrometer can be utilized for remote sensing imaging spectrometers where size and weight are of primary importance.

  11. Reflective optical imaging method and circuit

    DOE Patents [OSTI]

    Shafer, David R.

    2001-01-01

    An optical system compatible with short wavelength (extreme ultraviolet) radiation comprising four reflective elements for projecting a mask image onto a substrate. The four optical elements are characterized in order from object to image as convex, concave, convex and concave mirrors. The optical system is particularly suited for step and scan lithography methods. The invention increases the slit dimensions associated with ringfield scanning optics, improves wafer throughput and allows higher semiconductor device density.

  12. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lensless X-Ray Imaging in Reflection Print The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs combine the advantages of sychrotron light sources (high brightness and x-ray wavelengths relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are important for coherent x-ray diffraction imaging-lensless imaging

  13. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lensless X-Ray Imaging in Reflection Print The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs combine the advantages of sychrotron light sources (high brightness and x-ray wavelengths relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are important for coherent x-ray diffraction imaging-lensless imaging

  14. Diamond films treated with alkali-halides

    DOE Patents [OSTI]

    Anderson, David F.; Kwan, Simon W.

    1997-01-01

    A secondary electron emitter is provided and includes a substrate with a diamond film, the diamond film is treated or coated with an alkali-halide.

  15. Thin Film Solar Technologies | Open Energy Information

    Open Energy Info (EERE)

    help OpenEI by expanding it. Thin Film Solar Technologies is a company located in South Africa . References "Thin Film Solar Technologies" Retrieved from "http:...

  16. Innovative Thin Films LLC | Open Energy Information

    Open Energy Info (EERE)

    Thin Films LLC Place: Toledo, Ohio Zip: 43607 Product: Provider of altnernative energy thin film deposition technology. Coordinates: 46.440613, -122.847838 Show Map Loading...

  17. Diamond films treated with alkali-halides

    DOE Patents [OSTI]

    Anderson, D.F.; Kwan, S.W.

    1997-04-08

    A secondary electron emitter is provided and includes a substrate with a diamond film, the diamond film is treated or coated with an alkali-halide. 5 figs.

  18. Electrical initiation of an energetic nanolaminate film

    DOE Patents [OSTI]

    Tringe, Joseph W.; Gash, Alexander E.; Barbee, Jr., Troy W.

    2010-03-30

    A heating apparatus comprising an energetic nanolaminate film that produces heat when initiated, a power source that provides an electric current, and a control that initiates the energetic nanolaminate film by directing the electric current to the energetic nanolaminate film and joule heating the energetic nanolaminate film to an initiation temperature. Also a method of heating comprising providing an energetic nanolaminate film that produces heat when initiated, and initiating the energetic nanolaminate film by directing an electric current to the energetic nanolaminate film and joule heating the energetic nanolaminate film to an initiation temperature.

  19. Multiple-reflection optical gas cell

    DOE Patents [OSTI]

    Matthews, Thomas G.

    1983-01-01

    A multiple-reflection optical cell for Raman or fluorescence gas analysis consists of two spherical mirrors positioned transverse to a multiple-pass laser cell in a confronting plane-parallel alignment. The two mirrors are of equal diameter but possess different radii of curvature. The spacing between the mirrors is uniform and less than half of the radius of curvature of either mirror. The mirror of greater curvature possesses a small circular portal in its center which is the effective point source for conventional F1 double lens collection optics of a monochromator-detection system. Gas to be analyzed is flowed into the cell and irradiated by a multiply-reflected composite laser beam centered between the mirrors of the cell. Raman or fluorescence radiation originating from a large volume within the cell is (1) collected via multiple reflections with the cell mirrors, (2) partially collimated and (3) directed through the cell portal in a geometric array compatible with F1 collection optics.

  20. Light reflecting apparatus including a multi-aberration light reflecting surface

    DOE Patents [OSTI]

    Sawicki, Richard H.; Sweatt, William

    1987-01-01

    A light reflecting apparatus including a multi-aberration bendable light reflecting surface is disclosed herein. This apparatus includes a structural assembly comprised of a rectangular plate which is resiliently bendable, to a limited extent, and which has a front side defining the multi-aberration light reflecting surface and an opposite back side, and a plurality of straight leg members rigidly connected with the back side of the plate and extending rearwardly therefrom. The apparatus also includes a number of different adjustment mechanisms, each of which is connected with specific ones of the leg members. These mechanisms are adjustably movable in different ways for applying corresponding forces to the leg members in order to bend the rectangular plate and light reflecting surface into different predetermined curvatures and which specifically include quadratic and cubic curvatures corresponding to different optical aberrations.

  1. A light reflecting apparatus including a multi-aberration light reflecting surface

    DOE Patents [OSTI]

    Sawicki, R.H.; Sweatt, W.

    1985-11-21

    A light reflecting apparatus including a multi-aberration bendable light reflecting surface is disclosed herein. This apparatus includes a structural assembly comprised of a rectangular plate which is resiliently bendable, to a limited extent, and which has a front side defining the multi-aberration light reflecting surface and an opposite back side, and a plurality of straight leg members rigidly connected with the back side of the plate and extending rearwardly therefrom. The apparatus also includes a number of different adjustment mechanisms, each of which is connected with specific ones of the leg members. These mechanisms are adjustably movable in different ways for applying corresponding forces to the leg members in order to bend the rectangular plate and light reflecting surface into different predetermined curvatures and which specifically include quadratic and cubic curvatures corresponding to different optical aberrations.

  2. System for measuring film thickness

    DOE Patents [OSTI]

    Batishko, Charles R.; Kirihara, Leslie J.; Peters, Timothy J.; Rasmussen, Donald E.

    1990-01-01

    A system for determining the thicknesses of thin films of materials exhibiting fluorescence in response to exposure to excitation energy from a suitable source of such energy. A section of film is illuminated with a fixed level of excitation energy from a source such as an argon ion laser emitting blue-green light. The amount of fluorescent light produced by the film over a limited area within the section so illuminated is then measured using a detector such as a photomultiplier tube. Since the amount of fluorescent light produced is a function of the thicknesses of thin films, the thickness of a specific film can be determined by comparing the intensity of fluorescent light produced by this film with the intensity of light produced by similar films of known thicknesses in response to the same amount of excitation energy. The preferred embodiment of the invention uses fiber optic probes in measuring the thicknesses of oil films on the operational components of machinery which are ordinarily obscured from view.

  3. Liquid-film electron stripper

    DOE Patents [OSTI]

    Gavin, Basil F.

    1986-01-01

    An improved liquid-film electron stripper particularly for high intensity heavy ion beams which produces constant regenerated, stable, free-standing liquid films having an adjustable thickness between 0.3 to 0.05 microns. The improved electron stripper is basically composed of at least one high speed, rotating disc with a very sharp, precision-like, ground edge on one said of the disc's periphery and with a highly polished, flat, radial surface adjacent the sharp edge. A fine stream of liquid, such as oil, impinges at a 90.degree. angle adjacent the disc's sharp outer edge. Film terminators, located at a selected distance from the disc perimeter are positioned approximately perpendicular to the film. The terminators support, shape, and stretch the film and are arranged to assist in the prevention of liquid droplet formation by directing the collected film to a reservoir below without breaking or interfering with the film. One embodiment utilizes two rotating discs and associated terminators, with the discs rotating so as to form films in opposite directions, and with the second disc being located down beam-line relative to the first disc.

  4. Thin film ion conducting coating

    DOE Patents [OSTI]

    Goldner, Ronald B.; Haas, Terry; Wong, Kwok-Keung; Seward, George

    1989-01-01

    Durable thin film ion conducting coatings are formed on a transparent glass substrate by the controlled deposition of the mixed oxides of lithium:tantalum or lithium:niobium. The coatings provide durable ion transport sources for thin film solid state storage batteries and electrochromic energy conservation devices.

  5. Metal oxide films on metal

    DOE Patents [OSTI]

    Wu, Xin D. (Los Alamos, NM); Tiwari, Prabhat (Los Alamos, NM)

    1995-01-01

    A structure including a thin film of a conductive alkaline earth metal oxide selected from the group consisting of strontium ruthenium trioxide, calcium ruthenium trioxide, barium ruthenium trioxide, lanthanum-strontium cobalt oxide or mixed alkaline earth ruthenium trioxides thereof upon a thin film of a noble metal such as platinum is provided.

  6. Bandgap widening in thermochromic Mg-doped VO{sub 2} thin films: Quantitative data based on optical absorption

    SciTech Connect (OSTI)

    Li, Shu-Yi; Niklasson, Gunnar A.; Granqvist, Claes G.; Mlyuka, Nuru R.; Department of Physics, University of Dar es Salaam, P.O. Box 35063, Dar es Salaam ; Primetzhofer, Daniel; Possnert, Gran; Halln, Anders

    2013-10-14

    Thermochromic Mg-doped VO{sub 2} films were deposited by reactive direct current magnetron sputtering onto heated glass and carbon substrates. Elemental compositions were inferred from Rutherford backscattering. Optical bandgaps were obtained from spectral transmittance and reflectance measurementsfrom both the film side and the back side of the samplesand ensuing determination of absorption coefficients. The bandgap of Mg-doped films was found to increase by 3.9 0.5 eV per unit of atom ratio Mg/(Mg + V) for 0 < Mg/(Mg + V) < 0.21. The presence of ?0.45 at. % Si enhanced the bandgap even more.

  7. The preparation of a novel polymer film based on salicylaldoxime and its influence on aqueous copper electrochemistry

    SciTech Connect (OSTI)

    Davis, J.; Vaughan, D.H.; Cardosi, M.F.

    1994-07-01

    The metal complexing ligand salicylaldoxime was electropolymerized onto platinum electrodes and the resulting film characterized by reflectance FT-IR spectroscopy. The modified electrode response to aqueous iron, copper, cobalt and lead ions was investigated with the iron(III) and copper (II) ions showing significantly altered electrochemistry. The response of the modified electrode towards aqueous copper ion was found to be directly proportional to copper concentration with little interference from lead ions. The retention of copper ions, film stability and the nature of the film action are discussed along with its potential use in sensor construction.

  8. Anode film formation and control

    DOE Patents [OSTI]

    Koski, Oscar; Marschman, Steven C.

    1990-01-01

    A protective film is created about the anode within a cryolite-based electrolyte during electrolytic production of aluminum from alumina. The film function to minimize corrosion of the anode by the cryolitic electrolyte and thereby extend the life of the anode. Various operating parameters of the electrolytic process are controlled to maintain the protective film about the anode in a protective state throughout the electrolytic reduction of alumina. Such parameters include electrolyte temperature, electrolyte ratio, current density, and Al.sub.2 O.sub.3 concentration. An apparatus is also disclosed to enable identification of the onset of anode corrosion due to disruption of the film to provide real time information regarding the state of the film.

  9. Anode film formation and control

    DOE Patents [OSTI]

    Koski, O.; Marschman, S.C.

    1990-05-01

    A protective film is created about the anode within a cryolite-based electrolyte during electrolytic production of aluminum from alumina. The film functions to minimize corrosion of the anode by the cryolitic electrolyte and thereby extend the life of the anode. Various operating parameters of the electrolytic process are controlled to maintain the protective film about the anode in a protective state throughout the electrolytic reduction of alumina. Such parameters include electrolyte temperature, electrolyte ratio, current density, and Al[sub 2]O[sub 3] concentration. An apparatus is also disclosed to enable identification of the onset of anode corrosion due to disruption of the film to provide real time information regarding the state of the film. 3 figs.

  10. Reduced leakage in epitaxial BiFeO{sub 3} films following oxygen radio frequency plasma treatment

    SciTech Connect (OSTI)

    Kothari, Deepti [Institute for Plasma Research, Bhat, Gandhinagar 382428 (India) [Institute for Plasma Research, Bhat, Gandhinagar 382428 (India); UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452 017 (India); Upadhyay, Sanjay K.; Raghavendra Reddy, V. [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452 017 (India)] [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452 017 (India); Jariwala, C.; Raole, P. M. [Institute for Plasma Research, Bhat, Gandhinagar 382428 (India)] [Institute for Plasma Research, Bhat, Gandhinagar 382428 (India)

    2013-06-07

    Epitaxial BiFeO{sub 3} (BFO) films were deposited using pulsed laser deposition method. The prepared films were characterized using x-ray diffraction, x-ray reflectivity, ferroelectric loop tracer, and leakage current measurements before and after oxygen plasma treatment. The leakage current of the films, a crucial parameter in device applications, is observed to be reduced by two orders of magnitude with oxygen plasma treatment at room temperature. P-E hysteresis loops were observed in oxygen plasma treated BFO films. The observed results indicate the usefulness of oxygen radio frequency plasma treatment (RF 13.56 MHz), which is an effective and low temperature processing technique, in such lossy ferroelectric thin films.

  11. Total reflection infrared spectroscopy of water-ice and frozen aqueous NaCl solutions

    SciTech Connect (OSTI)

    Walker, Rachel L.; Searles, Keith; Willard, Jesse A.; Michelsen, Rebecca R. H., E-mail: RMichelsen@rmc.edu [Department of Chemistry, Randolph-Macon College, P.O. Box 5005, Ashland, Virginia 23005 (United States)] [Department of Chemistry, Randolph-Macon College, P.O. Box 5005, Ashland, Virginia 23005 (United States)

    2013-12-28

    Liquid-like and liquid water at and near the surface of water-ice and frozen aqueous sodium chloride films were observed using attenuated total reflection infrared spectroscopy (ATR-IR). The concentration of NaCl ranged from 0.0001 to 0.01 M and the temperature varied from the melting point of water down to 256 K. The amount of liquid brine at the interface of the frozen films with the germanium ATR crystal increased with salt concentration and temperature. Experimental spectra are compared to reflection spectra calculated for a simplified morphology of a uniform liquid layer between the germanium crystal and the frozen film. This morphology allows for the amount of liquid observed in an experimental spectrum to be converted to the thickness of a homogenous layer with an equivalent amount of liquid. These equivalent thickness ranges from a nanometer for water-ice at 260 K to 170 nm for 0.01 M NaCl close to the melting point. The amounts of brine observed are over an order of magnitude less than the total liquid predicted by equilibrium thermodynamic models, implying that the vast majority of the liquid fraction of frozen solutions may be found in internal inclusions, grain boundaries, and the like. Thus, the amount of liquid and the solutes dissolved in them that are available to react with atmospheric gases on the surfaces of snow and ice are not well described by thermodynamic equilibrium models which assume the liquid phase is located entirely at the surface.

  12. Properties of Cu(In,Ga,Al)Se{sub 2} thin films fabricated by magnetron sputtering

    SciTech Connect (OSTI)

    Hameed, Talaat A.; Cao, Wei; Mansour, Bahiga A.; Elzawaway, Inas K.; Abdelrazek, El-Metwally M.; Elsayed-Ali, Hani E.

    2015-05-15

    Cu(In,Ga,Al)Se{sub 2} (CIGAS) thin films were studied as an alternative absorber layer material to Cu(In{sub x}Ga{sub 1?x})Se{sub 2}. CIGAS thin films with varying Al content were prepared by magnetron sputtering on Si(100) and soda-lime glass substrates at 350?C, followed by postdeposition annealing at 520?C for 5 h in vacuum. The film composition was measured by an electron probe microanalyzer while the elemental depth profiles were determined by secondary ion mass spectrometry. X-ray diffraction studies indicated that CIGAS films are single phase with chalcopyrite structure and that the (112) peak clearly shifts to higher 2? values with increasing Al content. Scanning electron microscopy images revealed dense and well-defined grains, as well as sharp CIGAS/Si(100) interfaces for all films. Atomic force microscopy analysis indicated that the roughness of CIGAS films decreases with increasing Al content. The bandgap of CIGAS films was determined from the optical transmittance and reflectance spectra and was found to increase as Al content increased.

  13. Solar photovoltaic reflective trough collection structure

    DOE Patents [OSTI]

    Anderson, Benjamin J.; Sweatt, William C.; Okandan, Murat; Nielson, Gregory N.

    2015-11-19

    A photovoltaic (PV) solar concentration structure having at least two troughs encapsulated in a rectangular parallelepiped optical plastic structure, with the troughs filled with an optical plastic material, the troughs each having a reflective internal surface and approximately parabolic geometry, and the troughs each including photovoltaic cells situated so that light impinging on the optical plastic material will be concentrated onto the photovoltaic cells. Multiple structures can be connected to provide a solar photovoltaic collection system that provides portable, efficient, low-cost electrical power.

  14. Seismic reflection imaging at a Shallow Site

    SciTech Connect (OSTI)

    Milligan, P.; Rector, J.; Bainer, R.

    1997-01-01

    The objective of our studies was to determine the best seismic method to image these sediments, between the water table at 3 m depth to the basement at 35 m depth. Good cross-correlation between well logs and the seismic data was also desirable, and would facilitate the tracking of known lithological units away from the wells. For instance, known aquifer control boundaries may then be mapped out over the boundaries, and may be used in a joint inversion with reflectivity data and other non-seismic geophysical data to produce a 3-D image containing quantitative physical properties of the target area.

  15. Reflective optical imaging systems with balanced distortion

    DOE Patents [OSTI]

    Hudyma, Russell M.

    2001-01-01

    Optical systems compatible with extreme ultraviolet radiation comprising four reflective elements for projecting a mask image onto a substrate are described. The four optical elements comprise, in order from object to image, convex, concave, convex and concave mirrors. The optical systems are particularly suited for step and scan lithography methods. The invention enables the use of larger slit dimensions associated with ring field scanning optics, improves wafer throughput, and allows higher semiconductor device density. The inventive optical systems are characterized by reduced dynamic distortion because the static distortion is balanced across the slit width.

  16. Reflective optical imaging system with balanced distortion

    DOE Patents [OSTI]

    Chapman, Henry N.; Hudyma, Russell M.; Shafer, David R.; Sweeney, Donald W.

    1999-01-01

    An optical system compatible with short wavelength (extreme ultraviolet) An optical system compatible with short wavelength (extreme ultraviolet) radiation comprising four reflective elements for projecting a mask image onto a substrate. The four optical elements comprise, in order from object to image, convex, concave, convex and concave mirrors. The optical system is particularly suited for step and scan lithography methods. The invention enables the use of larger slit dimensions associated with ring field scanning optics, improves wafer throughput and allows higher semiconductor device density. The inventive optical system is characterized by reduced dynamic distortion because the static distortion is balanced across the slit width.

  17. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Imaging in Reflection Print The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs combine the advantages of sychrotron light sources (high brightness and x-ray wavelengths relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are important for coherent x-ray diffraction imaging-lensless imaging techniques that

  18. Lensless X-Ray Imaging in Reflection

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Imaging in Reflection Print The advent of x-ray free-electron laser (XFEL) light sources has led to an outburst of research activities in the field of lensless imaging. XFELs combine the advantages of sychrotron light sources (high brightness and x-ray wavelengths relevant to atomic and molecular phenomena) with the advantages of visible-light lasers (highly coherent beams). All of these characteristics are important for coherent x-ray diffraction imaging-lensless imaging techniques that

  19. Reflective echo tomographic imaging using acoustic beams

    DOE Patents [OSTI]

    Kisner, Roger; Santos-Villalobos, Hector J

    2014-11-25

    An inspection system includes a plurality of acoustic beamformers, where each of the plurality of acoustic beamformers including a plurality of acoustic transmitter elements. The system also includes at least one controller configured for causing each of the plurality of acoustic beamformers to generate an acoustic beam directed to a point in a volume of interest during a first time. Based on a reflected wave intensity detected at a plurality of acoustic receiver elements, an image of the volume of interest can be generated.

  20. Thin film hydrogen sensor

    DOE Patents [OSTI]

    Lauf, R.J.; Hoffheins, B.S.; Fleming, P.H.

    1994-11-22

    A hydrogen sensor element comprises an essentially inert, electrically-insulating substrate having a thin-film metallization deposited thereon which forms at least two resistors on the substrate. The metallization comprises a layer of Pd or a Pd alloy for sensing hydrogen and an underlying intermediate metal layer for providing enhanced adhesion of the metallization to the substrate. An essentially inert, electrically insulating, hydrogen impermeable passivation layer covers at least one of the resistors, and at least one of the resistors is left uncovered. The difference in electrical resistances of the covered resistor and the uncovered resistor is related to hydrogen concentration in a gas to which the sensor element is exposed. 6 figs.

  1. Ferromagnetic thin films

    DOE Patents [OSTI]

    Krishnan, K.M.

    1994-12-20

    A ferromagnetic [delta]-Mn[sub 1[minus]x]Ga[sub x] thin film having perpendicular anisotropy is described which comprises: (a) a GaAs substrate, (b) a layer of undoped GaAs overlying said substrate and bonded thereto having a thickness ranging from about 50 to about 100 nanometers, (c) a layer of [delta]-Mn[sub 1[minus]x]Ga[sub x] overlying said layer of undoped GaAs and bonded thereto having a thickness ranging from about 20 to about 30 nanometers, and (d) a layer of GaAs overlying said layer of [delta]-Mn[sub 1[minus]x]Ga[sub x] and bonded thereto having a thickness ranging from about 2 to about 5 nanometers, wherein x is 0.4[+-]0.05. 7 figures.

  2. Laser processing of solar cells with anti-reflective coating

    DOE Patents [OSTI]

    Harley, Gabriel; Smith, David D.; Dennis, Tim; Waldhauer, Ann; Kim, Taeseok; Cousins, Peter John

    2016-02-16

    Contact holes of solar cells are formed by laser ablation to accommodate various solar cell designs. Use of a laser to form the contact holes is facilitated by replacing films formed on the diffusion regions with a film that has substantially uniform thickness. Contact holes may be formed to deep diffusion regions to increase the laser ablation process margins. The laser configuration may be tailored to form contact holes through dielectric films of varying thicknesses.

  3. Methods for producing complex films, and films produced thereby...

    Office of Scientific and Technical Information (OSTI)

    This site is a product of DOE's Office of Scientific and Technical Information (OSTI) and ... A method for producing a film, the method comprising melting a layer of precursor ...

  4. Liquid-film electron stripper

    DOE Patents [OSTI]

    Leemann, B.T.; Yourd, R.B.

    1982-03-09

    A thin freestanding oil film is produced in vacuum by directing an oil stream radially inward to the hollow-ground sharp outer edge of a rotating disc. The sides of the edge are roughened somewhat to aid in dispersing oil from the disc. Oil is removed from the surface of disc to prevent formation of oil droplets which might spin off the disc and disrupt the oil film. An ion beam is directed through the thin oil film so that electrons are stripped from the ions to increase their charge.

  5. Liquid-film electron stripper

    DOE Patents [OSTI]

    Leemann, Beat T.; Yourd, Roland B.

    1984-01-01

    A thin freestanding oil film is produced in vacuum by directing an oil stream radially inward to the hollow-ground sharp outer edge of a rotating disc. The sides of the edge are roughened somewhat to aid in dispersing oil from the disc. Oil is removed from the surface of disc to prevent formation of oil droplets which might spin off the disc and disrupt the oil film. An ion beam is directed through the thin oil film so that electrons are stripped from the ions to increase their charge.

  6. Vapor deposition of thin films

    SciTech Connect (OSTI)

    Smith, D.C.; Pattillo, S.G.; Laia, J.R. Jr.; Sattelberger, A.P.

    1990-10-05

    A highly pure thin metal film having a nanocrystalline structure and a process of preparing such highly pure thin metal films of, e.g., rhodium, iridium, molybdenum, tungsten, rhenium, platinum, or palladium by plasma assisted chemical vapor deposition of, e.g., rhodium(allyl){sub 3}, iridium(allyl){sub 3}, molybdenum(allyl){sub 4}, tungsten(allyl){sub 4}, rhenium (allyl){sub 4}, platinum(allyl){sub 2}, or palladium(allyl){sub 2} are disclosed. Additionally, a general process of reducing the carbon content of a metallic film prepared from one or more organometallic precursor compounds by plasma assisted chemical vapor deposition is disclosed.

  7. Tailoring nanocrystalline diamond film properties

    DOE Patents [OSTI]

    Gruen, Dieter M.; McCauley, Thomas G.; Zhou, Dan; Krauss, Alan R.

    2003-07-15

    A method for controlling the crystallite size and growth rate of plasma-deposited diamond films. A plasma is established at a pressure in excess of about 55 Torr with controlled concentrations of hydrogen up to about 98% by volume, of unsubstituted hydrocarbons up to about 3% by volume and an inert gas of one or more of the noble gases and nitrogen up to about 98% by volume. The volume ratio of inert gas to hydrogen is preferably maintained at greater than about 4, to deposit a diamond film on a suitable substrate. The diamond film is deposited with a predetermined crystallite size and at a predetermined growth rate.

  8. Vapor deposition of thin films

    DOE Patents [OSTI]

    Smith, David C. (Los Alamos, NM); Pattillo, Stevan G. (Los Alamos, NM); Laia, Jr., Joseph R. (Los Alamos, NM); Sattelberger, Alfred P. (Los Alamos, NM)

    1992-01-01

    A highly pure thin metal film having a nanocrystalline structure and a process of preparing such highly pure thin metal films of, e.g., rhodium, iridium, molybdenum, tungsten, rhenium, platinum, or palladium by plasma assisted chemical vapor deposition of, e.g., rhodium(allyl).sub.3, iridium(allyl).sub.3, molybdenum(allyl).sub.4, tungsten(allyl).sub.4, rhenium(allyl).sub.4, platinum(allyl).sub.2, or palladium(allyl).sub.2 are disclosed. Additionally, a general process of reducing the carbon content of a metallic film prepared from one or more organometallic precursor compounds by plasma assisted chemical vapor deposition is disclosed.

  9. Reflection-Based Python-C++ Bindings

    SciTech Connect (OSTI)

    Generowicz, Jacek; Lavrijsen, Wim T.L.P.; Marino, Massimo; Mato, Pere

    2004-10-14

    Python is a flexible, powerful, high-level language with excellent interactive and introspective capabilities and a very clean syntax. As such, it can be a very effective tool for driving physics analysis. Python is designed to be extensible in low-level C-like languages, and its use as a scientific steering language has become quite widespread. To this end, existing and custom-written C or C++ libraries are bound to the Python environment as so-called extension modules. A number of tools for easing the process of creating such bindings exist, such as SWIG and Boost. Python. Yet, the process still requires a considerable amount of effort and expertise. The C++ language has few built-in introspective capabilities, but tools such as LCGDict and CINT add this by providing so-called dictionaries: libraries that contain information about the names, entry points, argument types, etc. of other libraries. The reflection information from these dictionaries can be used for the creation of bindings and so the process can be fully automated, as dictionaries are already provided for many end-user libraries for other purposes, such as object persistency. PyLCGDict is a Python extension module that uses LCG dictionaries, as PyROOT uses CINT reflection information, to allow /cwPython users to access C++ libraries with essentially no preparation on the users' behalf. In addition, and in a similar way, PyROOT gives ROOT users access to Python libraries.

  10. Lamp method and apparatus using multiple reflections

    DOE Patents [OSTI]

    MacLennan, Donald A.; Turner, Brian P.

    2001-01-01

    An electrodeless microwave discharge lamp includes an envelope with a discharge forming fill disposed therein which emits light, the fill being capable of absorbing light at one wavelength and re-emitting the absorbed light at a different wavelength, the light emitted from the fill having a first spectral power distribution in the absence of reflection of light back into the fill, a source of microwave energy coupled to the fill to excite the fill and cause the fill to emit light, and a reflector disposed within the microwave cavity and configured to reflect at least some of the light emitted by the fill back into the fill while allowing some light to exit, the exiting light having a second spectral power distribution with proportionately more light in the visible region as compared to the first spectral power distribution, wherein the light re-emitted by the fill is shifted in wavelength with respect to the absorbed light and the magnitude of the shift is in relation to an effective optical path length.

  11. Method for producing highly reflective metal surfaces

    DOE Patents [OSTI]

    Arnold, Jones B.; Steger, Philip J.; Wright, Ralph R.

    1983-01-01

    The invention is a novel method for producing mirror surfaces which are extremely smooth and which have high optical reflectivity. The method includes electrolessly depositing an amorphous layer of nickel on an article and then diamond-machining the resulting nickel surface to increase its smoothness and reflectivity. The machined nickel surface then is passivated with respect to the formation of bonds with electrodeposited nickel. Nickel then is electrodeposited on the passivated surface to form a layer of electroplated nickel whose inside surface is a replica of the passivated surface. The electroplated nickel layer then is separated from the passivated surface. The mandrel then may be re-passivated and provided with a layer of electrodeposited nickel, which is then recovered from the mandrel providing a second replica. The mandrel can be so re-used to provide many such replicas. As compared with producing each mirror-finished article by plating and diamond-machining, the new method is faster and less expensive.

  12. SU-E-T-445: Lateral Optical Density Variation in Flatbed Scanners in Combination with Gafchromic Film

    SciTech Connect (OSTI)

    Battum, LJ van; Heukelom, S

    2014-06-01

    Purpose This study investigates the origin of lateral optical density (OD) variation for Gafchromic film (EBT and EBT2) scanned in transmission mode with Epson flatbed scanners (1680 Expression Pro and 10000XL). Effects investigated are: cross talk, optical path length and polarization. Methods Cross talk has been examined with triangular shaped light-transmission sheets with OD ranging from 0 to opaque. Optical path length has been studied with absorptive and reflective OD-filters (OD range 0.2 to 2.0). Dependency on light-polarization on the scanner read out has been investigated using linear polarizer sheets. All experiments have been performed at centre scanner position (norm point) and at several lateral scan positions, without and with (un)irradiated EBT-film. Dose values used ranged between 0.2 to 9 Gy, yielding an OD-range between 0.25 to 1.1. Results The lateral OD variation is dose dependent and increases up to 14% at most lateral position for dose up to 9 Gy. Cross talk effect contributes to 0.5% in clinical used OD ranges but equals 2% for extreme high dose gradients. Film induced optical path length will effect the lateral OD variation up to 3% at most lateral points. Light polarization is inherent present in these scanners due to multiple reflection on mirrors. In addition film induced polarization is the most important effect generating the observed lateral OD variation. Both Gafchromic film base and sensitive layer have polarizing capabilities; for the sensitive layer its influence is dose dependent. Conclusions Lateral OD variation origins from optical physics (i.e. polarization and reflection) related to scanner and film construction. Cross talk can be ignored in film dosimetry for clinical used dose values and gradients. Therefore it is recommended to determine the lateral OD variation per film type and scanner.

  13. NREL Success Stories - SkyFuel Partnership Reflects Bright Future

    ScienceCinema (OSTI)

    Jorgensen, Gary; Gee, Randy

    2013-05-29

    NREL Scientists and SkyFuel share a story about how their partnership has resulted in a revolutionary concentrating solar power technology ReflecTech Mirror Film.

  14. Synthesis and characterization of SnO{sub 2} thin films doped with Fe to 10%

    SciTech Connect (OSTI)

    Lpez, E.; Marn, J.; Osorio, J.

    2014-05-15

    Appropriate conditions for SnO{sub 2} powder synthesis doped with iron to 10% by using sol-gel route are found. The powders obtained have been analyzed by means of analytic spectroscopic techniques: Raman, Mssbauer, diffuse reflectance, Fourier transform infrared, and X-ray diffraction. Sn{sub 0.9}Fe{sub 0.1}O{sub 2} thin films deposited by AC magnetron sputtering on silicon substrates are obtained and characterized. A crystal structure rutile-type was found for thin films.

  15. Surface plasma wave assisted second harmonic generation of laser over a metal film

    SciTech Connect (OSTI)

    Chauhan, Santosh; Parashar, J.

    2015-01-15

    Second harmonic generation of laser mode converted surface plasma wave (SPW) over a corrugated metal film is studied. The laser, impinged on the metal film, under attenuated total reflection configuration, excites SPW over the metal–vacuum interface. The excited SPW extends over a much wider surface area than the laser spot cross-section. It exerts a second harmonic ponderomotive force on metal electrons, imparting them velocity that beats with the surface ripple to produce a nonlinear current, driving resonant second harmonic surface plasma wave.

  16. Subwavelength films for standoff radiation dosimetry

    SciTech Connect (OSTI)

    Alvine, Kyle J.; Bernacki, Bruce E.; Bennett, Wendy D.; Schemer-Kohrn, Alan L.; Suter, Jonathan D.

    2015-05-22

    We present optical subwavelength nanostructure architecture suitable for standoff radiation dosimetry with remote optical readout in the visible or infrared spectral regions. To achieve this, films of subwavelength structures are fabricated over several square inches via the creation of a 2D non-close packed (NCP) array template of radiation-sensitive polymeric nanoparticles, followed by magnetron sputtering of a metallic coating to form a 2D array of separated hemispherical nanoscale metallic shells. The nanoshells are highly reflective at resonance in the visible or infrared depending on design. These structures and their behavior are based on the open ring resonator (ORR) architecture and have their analog in resonant inductive-capacitive (LC) circuits, which display a resonance wavelength that is inversely proportional to the square root of the product of the inductance and capacitance. Therefore, any modification of the nanostructure material properties due to radiation alters the inductive or capacitive behavior of the subwavelength features, which in turn changes their optical properties resulting in a shift in the optical resonance. This shift in resonance may be remotely interrogated actively using either laser illumination or passively by hyperspectral or multispectral sensing with broadband illumination. These structures may be designed to be either anisotropic or isotropic, which can also offer polarization-sensitive interrogation. We present experimental measurements of a radiation induced shift in the optical resonance of a subwavelength film after exposure to an absorbed dose of gamma radiation from 2 Mrad up to 62 Mrad demonstrating the effect. Interestingly the resonance shift is non-monotonic for this material system and possible radiation damage mechanisms to the nanoparticles are discussed.

  17. The Film Scanning and Reanalysis Project

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The Film Scanning National Security Science Latest Issue:April 2016 past issues All Issues » submit The Film Scanning and Reanalysis Project Scientists on a search-and-rescue mission find and scan nuclear weapons test films-before they disintegrate-and find surprises as they reanalyze the images with modern techniques. July 1, 2015 The Film Scanning Lawrence Livermore's Greg Spriggs (foreground) and Alan Carr, Los Alamos National Laboratory historian, dig through boxes of films in the vast Los

  18. Process for forming planarized films

    DOE Patents [OSTI]

    Pang, Stella W.; Horn, Mark W.

    1991-01-01

    A planarization process and apparatus which employs plasma-enhanced chemical vapor deposition (PECVD) to form plarnarization films of dielectric or conductive carbonaceous material on step-like substrates.

  19. Fabrication of amorphous diamond films

    DOE Patents [OSTI]

    Falabella, S.

    1995-12-12

    Amorphous diamond films having a significant reduction in intrinsic stress are prepared by biasing a substrate to be coated and depositing carbon ions thereon under controlled temperature conditions. 1 fig.

  20. Surface roughness effects on the solar reflectance of cool asphalt...

    Office of Scientific and Technical Information (OSTI)

    The model is then used to compute the reflectance of shingles with a mixture of different colored granules, when the reflectances of the corresponding mono-color shingles are ...

  1. High order reflectivity of graphite (HOPG) crystals for x ray...

    Office of Scientific and Technical Information (OSTI)

    High order reflectivity of graphite (HOPG) crystals for x ray energies up to 22 keV Citation Details In-Document Search Title: High order reflectivity of graphite (HOPG) crystals ...

  2. Variable temperature semiconductor film deposition

    DOE Patents [OSTI]

    Li, Xiaonan; Sheldon, Peter

    1998-01-01

    A method of depositing a semiconductor material on a substrate. The method sequentially comprises (a) providing the semiconductor material in a depositable state such as a vapor for deposition on the substrate; (b) depositing the semiconductor material on the substrate while heating the substrate to a first temperature sufficient to cause the semiconductor material to form a first film layer having a first grain size; (c) continually depositing the semiconductor material on the substrate while cooling the substrate to a second temperature sufficient to cause the semiconductor material to form a second film layer deposited on the first film layer and having a second grain size smaller than the first grain size; and (d) raising the substrate temperature, while either continuing or not continuing to deposit semiconductor material to form a third film layer, to thereby anneal the film layers into a single layer having favorable efficiency characteristics in photovoltaic applications. A preferred semiconductor material is cadmium telluride deposited on a glass/tin oxide substrate already having thereon a film layer of cadmium sulfide.

  3. Variable temperature semiconductor film deposition

    DOE Patents [OSTI]

    Li, X.; Sheldon, P.

    1998-01-27

    A method of depositing a semiconductor material on a substrate is disclosed. The method sequentially comprises (a) providing the semiconductor material in a depositable state such as a vapor for deposition on the substrate; (b) depositing the semiconductor material on the substrate while heating the substrate to a first temperature sufficient to cause the semiconductor material to form a first film layer having a first grain size; (c) continually depositing the semiconductor material on the substrate while cooling the substrate to a second temperature sufficient to cause the semiconductor material to form a second film layer deposited on the first film layer and having a second grain size smaller than the first grain size; and (d) raising the substrate temperature, while either continuing or not continuing to deposit semiconductor material to form a third film layer, to thereby anneal the film layers into a single layer having favorable efficiency characteristics in photovoltaic applications. A preferred semiconductor material is cadmium telluride deposited on a glass/tin oxide substrate already having thereon a film layer of cadmium sulfide.

  4. Control of reflected electromagnetic fields at an IFSAR antenna

    DOE Patents [OSTI]

    Allen, Steven E. (Albuquerque, NM); Brock, Billy C. (Albuquerque, NM)

    2003-12-09

    A system for reducing multi-path reflections from adjacent metal objects which cause distortion in an IFSAR includes a reflective cone extending between the top of the IFSAR and the skin of its aircraft, and a reflective shroud surrounding the IFSAR. Each of these components may be coated with radar absorbing material.

  5. Photovoltaic Polycrystalline Thin-Film Cell Basics | Department...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Polycrystalline Thin-Film Cell Basics Photovoltaic Polycrystalline Thin-Film Cell Basics ... Silicon Single-Crystalline Thin Films Addthis Related Articles Photovoltaic Cell Structure ...

  6. Final project report - CRADA with United Solar Technologies and Pacific Northwest Laboratory (PNL-021): Thin film materials for low-cost high performance solar concentrators

    SciTech Connect (OSTI)

    Martin, P.M.; Affinito, J.D.; Gross, M.E.; Bennett, W.D.

    1995-03-01

    The objectives of this project were as follows: To develop and evaluate promising low-cost dielectric and polymer-protected thin-film reflective metal coatings to be applied to preformed continuously-curved solar reflector panels to enhance their solar reflectance, and to demonstrate protected solar reflective coatings on preformed solar concentrator panels. The opportunity for this project arose from a search by United Solar Technologies (UST) for organizations and facilities capable of applying reflective coatings to large preformed panels. PNL was identified as being uniquely qualified to participate in this collaborative project.

  7. Design and development of an in-line sputtering system and process development of thin film multilayer neutron supermirrors

    SciTech Connect (OSTI)

    Biswas, A.; Sampathkumar, R.; Kumar, Ajaya; Bhattacharyya, D.; Sahoo, N. K.; Lagoo, K. D.; Veerapur, R. D.; Padmanabhan, M.; Puri, R. K.; Bhattacharya, Debarati; Singh, Surendra; Basu, S.

    2014-12-15

    Neutron supermirrors and supermirror polarizers are thin film multilayer based devices which are used for reflecting and polarizing neutrons in various neutron based experiments. In the present communication, the in-house development of a 9 m long in-line dc sputtering system has been described which is suitable for deposition of neutron supermirrors on large size (1500 mm 150 mm) substrates and in large numbers. The optimisation process of deposition of Co and Ti thin film, Co/Ti periodic multilayers, and a-periodic supermirrors have also been described. The system has been used to deposit thin film multilayer supermirror polarizers which show high reflectivity up to a reasonably large critical wavevector transfer of ?0.06 {sup ?1} (corresponding to m = 2.5, i.e., 2.5 times critical wavevector transfer of natural Ni). The computer code for designing these supermirrors has also been developed in-house.

  8. Growth mechanism and optical properties of Ti thin films deposited onto fluorine-doped tin oxide glass substrate

    SciTech Connect (OSTI)

    Einollahzadeh-Samadi, Motahareh; Dariani, Reza S.

    2015-03-15

    In this work, a detailed study of the influence of the thickness on the morphological and optical properties of titanium (Ti) thin films deposited onto rough fluorine-doped tin oxide glass by d.c. magnetron sputtering is carried out. The films were characterized by several methods for composition, crystallinity, morphology, and optical properties. Regardless of the deposition time, all the studied Ti films of 400, 1500, 2000, and 2500?nm in thickness were single crystalline in the ?-Ti phase and also very similar to each other with respect to composition. Using the atomic force microscopy (AFM) technique, the authors analyzed the roughness evolution of the Ti films characteristics as a function of the film thickness. By applying the dynamic scaling theory to the AFM images, a steady growth roughness exponent ??=?0.72??0.02 and a dynamic growth roughness exponent ??=?0.22??0.02 were determined. The value of ? and ? are consistent with nonlinear growth model incorporating random deposition with surface diffusion. Finally, measuring the reflection spectra of the samples by a spectrophotometer in the spectral range of 3001100?nm allowed us to investigate the optical properties. The authors observed the increments of the reflection of Ti films with thickness, which by employing the effective medium approximation theory showed an increase in thickness followed by an increase in the volume fraction of metal.

  9. Molecular layer deposition of alucone films using trimethylaluminum and hydroquinone

    SciTech Connect (OSTI)

    Choudhury, Devika; Sarkar, Shaibal K.; Mahuli, Neha

    2015-01-01

    A hybrid organicinorganic polymer film grown by molecular layer deposition (MLD) is demonstrated here. Sequential exposures of trimethylaluminum [Al(CH{sub 3}){sub 3}] and hydroquinone [C{sub 6}H{sub 4}(OH){sub 2}] are used to deposit the polymeric films, which is a representative of a class of aluminum oxide polymers known as alucones. In-situ quartz crystal microbalance (QCM) studies are employed to determine the growth characteristics. An average growth rate of 4.1 per cycle at 150?C is obtained by QCM and subsequently verified with x-ray reflectivity measurements. Surface chemistry during each MLD-half cycle is studied in depth by in-situ Fourier transform infrared (FTIR) vibration spectroscopy. Self limiting nature of the reaction is confirmed from both QCM and FTIR measurements. The conformal nature of the deposit, typical for atomic layer deposition and MLD, is verified with transmission electron microscopy imaging. Secondary ion mass spectroscopy measurements confirm the uniform elemental distribution along the depth of the films.

  10. Multilayer films with sharp, stable interfaces for use in EUV and soft X-ray application

    DOE Patents [OSTI]

    Barbee, Jr., Troy W.; Bajt, Sasa

    2002-01-01

    The reflectivity and thermal stability of Mo/Si (molybdenum/silicon) multilayer films, used in soft x-ray and extreme ultraviolet region, is enhanced by deposition of a thin layer of boron carbide (e.g., B.sub.4 C) between alternating layers of Mo and Si. The invention is useful for reflective coatings for soft X-ray and extreme ultraviolet optics, multilayer for masks, coatings for other wavelengths and multilayers for masks that are more thermally stable than pure Mo/Si multilayers

  11. Demonstration of a plasma mirror based on a laminar flow water film

    SciTech Connect (OSTI)

    Panasenko, Dmitriy; Shu, Anthony; Gonsalves, Anthony; Nakamura, Kei; Matlis, Nicholas; Toth, Csaba; Leemans, Wim

    2011-07-22

    A plasma mirror based on a laminar water film with low flow speed 0.5-2 cm/s has been developed and characterized, for use as an ultrahigh intensity optical reflector. The use of flowing water as atarget surface automatically results in each laser pulse seeing a new interaction surface and avoids the need for mechanical scanning of the target surface. In addition, the breakdown of water does notproduce contaminating debris that can be deleterious to vacuum chamber conditions and optics, such as is the case when using conventional solid targets. The mirror exhibits 70percent reflectivity, whilemaintaining high-quality of the reflected spot.

  12. Demonstration of a plasma mirror based on a laminar flow water film

    SciTech Connect (OSTI)

    Panasenko, Dmitriy; Shu, Anthony J.; Gonsalves, Anthony; Nakamura, Kei; Matlis, Nicholas H.; Toth, Csaba; Leemans, Wim P. [Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States)

    2010-08-15

    A plasma mirror based on a laminar water film with low flow speed (0.5-2 cm/s) has been developed and characterized, for use as an ultrahigh intensity optical reflector. The use of flowing water as a target surface automatically results in each laser pulse seeing a new interaction surface and avoids the need for mechanical scanning of the target surface. In addition, the breakdown of water does not produce contaminating debris that can be deleterious to vacuum chamber conditions and optics, such as is the case when using conventional solid targets. The mirror exhibits 70% reflectivity, while maintaining high-quality of the reflected spot.

  13. LED structure with enhanced mirror reflectivity

    DOE Patents [OSTI]

    Bergmann, Michael; Donofrio, Matthew; Heikman, Sten; Schneider, Kevin S; Haberern, Kevin W; Edmond, John A

    2014-04-01

    Embodiments of the present invention are generally related to LED chips having improved overall emission by reducing the light-absorbing effects of barrier layers adjacent mirror contacts. In one embodiment, a LED chip comprises one or more LEDs, with each LED having an active region, a first contact under the active region having a highly reflective mirror, and a barrier layer adjacent the mirror. The barrier layer is smaller than the mirror such that it does not extend beyond the periphery of the mirror. In another possible embodiment, an insulator is further provided, with the insulator adjacent the barrier layer and adjacent portions of the mirror not contacted by the active region or by the barrier layer. In yet another embodiment, a second contact is provided on the active region. In a further embodiment, the barrier layer is smaller than the mirror such that the periphery of the mirror is at least 40% free of the barrier layer, and the second contact is below the first contact and accessible from the bottom of the chip.

  14. Highly conducting SrMoO{sub 3} thin films for microwave applications

    SciTech Connect (OSTI)

    Radetinac, Aldin Mani, Arzhang; Ziegler, Jrgen; Alff, Lambert; Komissinskiy, Philipp; Melnyk, Sergiy; Nikfalazar, Mohammad; Zheng, Yuliang; Jakoby, Rolf

    2014-09-15

    We have measured the microwave resistance of highly conducting perovskite oxide SrMoO{sub 3} thin film coplanar waveguides. The epitaxial SrMoO{sub 3} thin films were grown by pulsed laser deposition and showed low mosaicity and smooth surfaces with a root mean square roughness below 0.3?nm. Layer-by-layer growth could be achieved for film thicknesses up to 400?nm as monitored by reflection high-energy electron diffraction and confirmed by X-ray diffraction. We obtained a constant microwave resistivity of 29???cm between 0.1 and 20?GHz by refining the frequency dependence of the transmission coefficients. Our result shows that SrMoO{sub 3} is a viable candidate as a highly conducting electrode material for all-oxide microwave electronic devices.

  15. Measurement of Transient Atomic-scale Displacements in Thin Films with

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Picosecond and Femtometer Resolution | Stanford Synchrotron Radiation Lightsource Measurement of Transient Atomic-scale Displacements in Thin Films with Picosecond and Femtometer Resolution Saturday, May 31, 2014 Figure 1 Fig. 1. Fractional changes in (a) PZT, (b) Bi and (c) BFO lattice spacings Dd/d measured with the (003), (222) and (220) reflections, respectively, collected in the short-pulse low-a mode. The inset shows a streak camera measurement of the x-ray pulse duration. Ultrafast

  16. Method to adjust multilayer film stress induced deformation of optics

    DOE Patents [OSTI]

    Spiller, Eberhard A.; Mirkarimi, Paul B.; Montcalm, Claude; Bajt, Sasa; Folta, James A.

    2000-01-01

    Stress compensating systems that reduces/compensates stress in a multilayer without loss in reflectivity, while reducing total film thickness compared to the earlier buffer-layer approach. The stress free multilayer systems contain multilayer systems with two different material combinations of opposite stress, where both systems give good reflectivity at the design wavelengths. The main advantage of the multilayer system design is that stress reduction does not require the deposition of any additional layers, as in the buffer layer approach. If the optical performance of the two systems at the design wavelength differ, the system with the poorer performance is deposited first, and then the system with better performance last, thus forming the top of the multilayer system. The components for the stress reducing layer are chosen among materials that have opposite stress to that of the preferred multilayer reflecting stack and simultaneously have optical constants that allow one to get good reflectivity at the design wavelength. For a wavelength of 13.4 nm, the wavelength presently used for extreme ultraviolet (EUV) lithography, Si and Be have practically the same optical constants, but the Mo/Si multilayer has opposite stress than the Mo/Be multilayer. Multilayer systems of these materials have practically identical reflectivity curves. For example, stress free multilayers can be formed on a substrate using Mo/Be multilayers in the bottom of the stack and Mo/Si multilayers at the top of the stack, with the switch-over point selected to obtain zero stress. In this multilayer system, the switch-over point is at about the half point of the total thickness of the stack, and for the Mo/Be--Mo/Si system, there may be 25 deposition periods Mo/Be to 20 deposition periods Mo/Si.

  17. Development and Testing of Abrasion Resistant Hard Coats For Polymer Film Reflectors: Preprint

    SciTech Connect (OSTI)

    Jorgensen, G.; Gee, R.; DiGrazia, M.

    2010-10-01

    Reflective polymer film technology can significantly reduce the cost of solar reflectors and installed Concentrated Solar Power (CSP) plants by both reduced material cost and lower weight. One challenge of polymer reflectors in the CSP environment pertains to contact cleaning methods typically used with glass mirrors. Such contact cleaning methods can scratch the surface of polymer reflectors and thereby reduce specular reflectance. ReflecTech, Inc. (a subsidiary of SkyFuel, Inc.) and the National Renewable Energy Laboratory (NREL) initiated a cooperative research and development agreement (CRADA) to devise and develop an abrasion resistant coating (ARC) suitable for deposition onto polymer based mirror film. A number of candidate ARC products were identified as candidate formulations. Industrial collaborators prepared samples having their ARCs deposited onto ReflecTech Mirror Film pre-laminated to aluminum sheet substrates. Samples were provided for evaluation and subjected to baseline (unweathered) and accelerated exposure conditions and subsequently characterized for abrasion resistance and adhesion. An advanced ARC product has been identified that exhibits outstanding initial abrasion resistance and adhesion to ReflecTech Mirror Film. These properties were also retained after exposure to the various accelerated stress conditions. This material has been successfully manufactured as a 1.5 m wide roll-to-roll construction in a production environment.

  18. Goos-Hänchen effect and bending of spin wave beams in thin magnetic films

    SciTech Connect (OSTI)

    Gruszecki, P. Krawczyk, M.; Romero-Vivas, J.; Dadoenkova, Yu. S.; Dadoenkova, N. N.; Lyubchanskii, I. L.

    2014-12-15

    For magnon spintronic applications, the detailed knowledge of spin wave (SW) beam dispersion, transmission (reflection) of SWs passing through (reflected from) interfaces, or borders or the scattering of SWs by inhomogeneities is crucial. These wave properties are decisive factors on the usefulness of a particular device. Here, we demonstrate, using micromagnetic simulations supported by an analytical model, that the Goos-Hänchen (GH) shift exists for SW reflecting from thin film edge and that with the effect becomes observable. We show that this effect will exist for a broad range of frequencies in the dipole-exchange range, with the magnetization degree of pinning at the film edge as the crucial parameter, whatever its nature. Moreover, we have also found that the GH effect can be accompanied or even dominating by a bending of the SW beam due to the inhomogeneity of the internal magnetic field. This inhomogeneity, created by demagnetizing field taking place at the film edge, causes gradual change of SWs refractive index. The refraction of the SW beams by the non-uniformity of the magnetic field enables the exploration of graded index magnonics and metamaterial properties for the transmission and processing of information at nanoscale.

  19. Low work function, stable thin films

    DOE Patents [OSTI]

    Dinh, Long N.; McLean, II, William; Balooch, Mehdi; Fehring, Jr., Edward J.; Schildbach, Marcus A.

    2000-01-01

    Generation of low work function, stable compound thin films by laser ablation. Compound thin films with low work function can be synthesized by simultaneously laser ablating silicon, for example, and thermal evaporating an alkali metal into an oxygen environment. For example, the compound thin film may be composed of Si/Cs/O. The work functions of the thin films can be varied by changing the silicon/alkali metal/oxygen ratio. Low work functions of the compound thin films deposited on silicon substrates were confirmed by ultraviolet photoelectron spectroscopy (UPS). The compound thin films are stable up to 500.degree. C. as measured by x-ray photoelectron spectroscopy (XPS). Tests have established that for certain chemical compositions and annealing temperatures of the compound thin films, negative electron affinity (NEA) was detected. The low work function, stable compound thin films can be utilized in solar cells, field emission flat panel displays, electron guns, and cold cathode electron guns.

  20. Semiconductor-nanocrystal/conjugated polymer thin films

    DOE Patents [OSTI]

    Alivisatos, A. Paul; Dittmer, Janke J.; Huynh, Wendy U.; Milliron, Delia

    2010-08-17

    The invention described herein provides for thin films and methods of making comprising inorganic semiconductor-nanocrystals dispersed in semiconducting-polymers in high loading amounts. The invention also describes photovoltaic devices incorporating the thin films.

  1. Electrostatic thin film chemical and biological sensor

    DOE Patents [OSTI]

    Prelas, Mark A.; Ghosh, Tushar K.; Tompson, Jr., Robert V.; Viswanath, Dabir; Loyalka, Sudarshan K.

    2010-01-19

    A chemical and biological agent sensor includes an electrostatic thin film supported by a substrate. The film includes an electrostatic charged surface to attract predetermined biological and chemical agents of interest. A charge collector associated with said electrostatic thin film collects charge associated with surface defects in the electrostatic film induced by the predetermined biological and chemical agents of interest. A preferred sensing system includes a charge based deep level transient spectroscopy system to read out charges from the film and match responses to data sets regarding the agents of interest. A method for sensing biological and chemical agents includes providing a thin sensing film having a predetermined electrostatic charge. The film is exposed to an environment suspected of containing the biological and chemical agents. Quantum surface effects on the film are measured. Biological and/or chemical agents can be detected, identified and quantified based on the measured quantum surface effects.

  2. Thin film-coated polymer webs

    DOE Patents [OSTI]

    Wenz, Robert P.; Weber, Michael F.; Arudi, Ravindra L.

    1992-02-04

    The present invention relates to thin film-coated polymer webs, and more particularly to thin film electronic devices supported upon a polymer web, wherein the polymer web is treated with a purifying amount of electron beam radiation.

  3. Proximity effects of superconducting multilayer film

    SciTech Connect (OSTI)

    Xueyu, C.; Daole, Y.

    1984-07-01

    The proximity effects of superconducting multilayer films composed of different metals are considered. The relationship between the critical temperature of a superconducting multilayer film with strong heterogeneity and its geometric structure is given.

  4. Thin film buried anode battery

    DOE Patents [OSTI]

    Lee, Se-Hee; Tracy, C. Edwin; Liu, Ping

    2009-12-15

    A reverse configuration, lithium thin film battery (300) having a buried lithium anode layer (305) and process for making the same. The present invention is formed from a precursor composite structure (200) made by depositing electrolyte layer (204) onto substrate (201), followed by sequential depositions of cathode layer (203) and current collector (202) on the electrolyte layer. The precursor is subjected to an activation step, wherein a buried lithium anode layer (305) is formed via electroplating a lithium anode layer at the interface of substrate (201) and electrolyte film (204). The electroplating is accomplished by applying a current between anode current collector (201) and cathode current collector (202).

  5. Biaxially oriented film on flexible polymeric substrate

    DOE Patents [OSTI]

    Finkikoglu, Alp T.; Matias, Vladimir

    2009-10-13

    A flexible polymer-based template having a biaxially oriented film grown on the surface of a polymeric substrate. The template having the biaxially oriented film can be used for further epitaxial growth of films of interest for applications such as photovoltaic cells, light emitting diodes, and the like. Methods of forming such a flexible template and providing the polymeric substrate with a biaxially oriented film deposited thereon are also described.

  6. DOE - NNSA/NFO -- Test Films

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Historical Test Films > Film Page NNSA/NFO Language Options U.S. DOE/NNSA - Nevada Field Office Historical Test Film Instructions: Click the Windows Media or MPG Movie link below the thumbnail to view the video Film details are listed on the right under Description Click the Full Text link for additional information about the video Refer to the Viewing Instructions and FAQs

  7. Silicon nanocrystal inks, films, and methods

    DOE Patents [OSTI]

    Wheeler, Lance Michael; Kortshagen, Uwe Richard

    2015-09-01

    Silicon nanocrystal inks and films, and methods of making and using silicon nanocrystal inks and films, are disclosed herein. In certain embodiments the nanocrystal inks and films include halide-terminated (e.g., chloride-terminated) and/or halide and hydrogen-terminated nanocrystals of silicon or alloys thereof. Silicon nanocrystal inks and films can be used, for example, to prepare semiconductor devices.

  8. Spectral behavior of the optical constants in the visible/near infrared of GeSbSe chalcogenide thin films grown at glancing angle

    SciTech Connect (OSTI)

    Martin-Palma, R. J.; Ryan, Joseph V.; Pantano, C. G.

    2007-04-23

    GeSbSe chalcogenide thin films were deposited using glancing angle deposition onto transparent glass substrates for the determination of the spectral behavior of the optical constants (index of refraction n and extinction coefficient k) in the visible and near infrared ranges (400-2500 nm) as a function of the deposition angle. Computational simulations based on the matrix method were employed to determine the values of the optical constants of the different films from the experimental reflectance and transmittance spectra. A significant dependence of the overall optical behavior on the deposition angle is found. Furthermore, the band gap of the GeSbSe thin films was calculated. The accurate determination of the optical constants of films grown at glancing angle will enable the development of sculptured thin film fiber-optic chemical sensors and biosensors.

  9. Acoustic phonon dynamics in thin-films of the topological insulator Bi{sub 2}Se{sub 3}

    SciTech Connect (OSTI)

    Glinka, Yuri D.; Babakiray, Sercan; Johnson, Trent A.; Holcomb, Mikel B.; Lederman, David

    2015-04-28

    Transient reflectivity traces measured for nanometer-sized films (6–40 nm) of the topological insulator Bi{sub 2}Se{sub 3} revealed GHz-range oscillations driven within the relaxation of hot carriers photoexcited with ultrashort (∼100 fs) laser pulses of 1.51 eV photon energy. These oscillations have been suggested to result from acoustic phonon dynamics, including coherent longitudinal acoustic phonons in the form of standing acoustic waves. An increase of oscillation frequency from ∼35 to ∼70 GHz with decreasing film thickness from 40 to 15 nm was attributed to the interplay between two different regimes employing traveling-acoustic-waves for films thicker than 40 nm and the film bulk acoustic wave resonator (FBAWR) modes for films thinner than 40 nm. The amplitude of oscillations decays rapidly for films below 15 nm thick when the indirect intersurface coupling in Bi{sub 2}Se{sub 3} films switches the FBAWR regime to that of the Lamb wave excitation. The frequency range of coherent longitudinal acoustic phonons is in good agreement with elastic properties of Bi{sub 2}Se{sub 3}.

  10. Microstructure and magnetic properties of FeCo epitaxial thin films grown on MgO single-crystal substrates

    SciTech Connect (OSTI)

    Shikada, Kouhei; Ohtake, Mitsuru; Futamoto, Masaaki; Kirino, Fumiyoshi

    2009-04-01

    FeCo epitaxial films were prepared on MgO(100), MgO(110), and MgO(111) substrates by ultrahigh vacuum molecular beam epitaxy. FeCo thin films with (100), (211), and (110) planes parallel to the substrate surface grow on respective MgO substrates. FeCo/MgO interface structures are studied by high-resolution cross-sectional transmission electron microscopy and the epitaxial growth mechanism is discussed. Atomically sharp boundaries are recognized between the FeCo thin films and the MgO substrates where misfit dislocations are introduced in the FeCo thin films presumably to decrease the lattice misfits. Misfit dislocations are observed approximately every 9 and 1.4 nm in FeCo thin film at the FeCo/MgO(100) and the FeCo/MgO(110) interfaces, respectively. X-ray diffraction analysis indicates that the lattice spacing measured parallel to the single-crystal substrate surfaces are in agreement within 0.1% with those of the respective bulk values of Fe{sub 50}Co{sub 50} alloy crystal, showing that the FeCo film strain is very small. The magnetic anisotropies of these epitaxial films basically reflect the magnetocrystalline anisotropy of bulk FeCo alloy crystal.

  11. Thin-film fiber optic hydrogen and temperature sensor system

    DOE Patents [OSTI]

    Nave, Stanley E.

    1998-01-01

    The invention discloses a sensor probe device for monitoring of hydrogen gas concentrations and temperatures by the same sensor probe. The sensor probe is constructed using thin-film deposition methods for the placement of a multitude of layers of materials sensitive to hydrogen concentrations and temperature on the end of a light transparent lens located within the sensor probe. The end of the lens within the sensor probe contains a lens containing a layer of hydrogen permeable material which excludes other reactive gases, a layer of reflective metal material that forms a metal hydride upon absorbing hydrogen, and a layer of semi-conducting solid that is transparent above a temperature dependent minimum wavelength for temperature detection. The three layers of materials are located at the distal end of the lens located within the sensor probe. The lens focuses light generated by broad-band light generator and connected by fiber-optics to the sensor probe, onto a reflective metal material layer, which passes through the semi-conducting solid layer, onto two optical fibers located at the base of the sensor probe. The reflected light is transmitted over fiberoptic cables to a spectrometer and system controller. The absence of electrical signals and electrical wires in the sensor probe provides for an elimination of the potential for spark sources when monitoring in hydrogen rich environments, and provides a sensor free from electrical interferences.

  12. Thin-film fiber optic hydrogen and temperature sensor system

    DOE Patents [OSTI]

    Nave, S.E.

    1998-07-21

    The invention discloses a sensor probe device for monitoring of hydrogen gas concentrations and temperatures by the same sensor probe. The sensor probe is constructed using thin-film deposition methods for the placement of a multitude of layers of materials sensitive to hydrogen concentrations and temperature on the end of a light transparent lens located within the sensor probe. The end of the lens within the sensor probe contains a lens containing a layer of hydrogen permeable material which excludes other reactive gases, a layer of reflective metal material that forms a metal hydride upon absorbing hydrogen, and a layer of semi-conducting solid that is transparent above a temperature dependent minimum wavelength for temperature detection. The three layers of materials are located at the distal end of the lens located within the sensor probe. The lens focuses light generated by broad-band light generator and connected by fiber-optics to the sensor probe, onto a reflective metal material layer, which passes through the semi-conducting solid layer, onto two optical fibers located at the base of the sensor probe. The reflected light is transmitted over fiber optic cables to a spectrometer and system controller. The absence of electrical signals and electrical wires in the sensor probe provides for an elimination of the potential for spark sources when monitoring in hydrogen rich environments, and provides a sensor free from electrical interferences. 3 figs.

  13. Method of producing thin cellulose nitrate film

    DOE Patents [OSTI]

    Lupica, S.B.

    1975-12-23

    An improved method for forming a thin nitrocellulose film of reproducible thickness is described. The film is a cellulose nitrate film, 10 to 20 microns in thickness, cast from a solution of cellulose nitrate in tetrahydrofuran, said solution containing from 7 to 15 percent, by weight, of dioctyl phthalate, said cellulose nitrate having a nitrogen content of from 10 to 13 percent.

  14. A reflective optical transport system for ultraviolet Thomson scattering

    Office of Scientific and Technical Information (OSTI)

    from electron plasma waves on OMEGA (Journal Article) | SciTech Connect A reflective optical transport system for ultraviolet Thomson scattering from electron plasma waves on OMEGA Citation Details In-Document Search Title: A reflective optical transport system for ultraviolet Thomson scattering from electron plasma waves on OMEGA A reflective optical transport system has been designed for the OMEGA Thomson-scattering diagnostic. A Schwarzschild objective that uses two concentric spherical

  15. Reflection Survey At Coso Geothermal Area (1989) | Open Energy...

    Open Energy Info (EERE)

    1989) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Activity: Reflection Survey At Coso Geothermal Area (1989) Exploration Activity Details Location Coso...

  16. Measuring solar reflectance Part I: Defining a metric that accurately...

    Office of Scientific and Technical Information (OSTI)

    I: Defining a metric that accurately predicts solar heat gain Citation Details In-Document Search Title: Measuring solar reflectance Part I: Defining a metric that accurately ...

  17. Surface roughness effects on the solar reflectance of cool asphalt...

    Office of Scientific and Technical Information (OSTI)

    Journal Article: Surface roughness effects on the solar reflectance of cool asphalt shingles Citation Details In-Document Search Title: Surface roughness effects on the solar ...

  18. Measurement of reflectivity of spherically bent crystals using...

    Office of Scientific and Technical Information (OSTI)

    electrons produced by laser-matter interaction In an experiment at the laser facility ECLIPSE of the CELIA laboratory, University of Bordeaux, we measure the reflectivity of ...

  19. Clean Energy Transition: Reflections on the Past Decade

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Clean Energy Transition: Reflections on the Past Decade NREL Industry Growth Forum Dr. Dan E. Arvizu Laboratory Director November 2015 2 Energy Market Fundamentals Globally...

  20. Combined Reflectivity/imaging Method for Assessing Diagnostic...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    with laser treatment to restore the reflectivity of diagnostic mirrors after degradation by plasma deposition. Multiple mirrors, including an aluminum first surface reference ...

  1. Reflection Survey At Neal Hot Springs Geothermal Area (Colwell...

    Open Energy Info (EERE)

    At Neal Hot Springs Geothermal Area (Colwell, Et Al., 2012) Exploration Activity Details Location Neal Hot Springs Geothermal Area Exploration Technique Reflection Survey Activity...

  2. Reflection Survey At The Needles Area (DOE GTP) | Open Energy...

    Open Energy Info (EERE)

    The Needles Area (DOE GTP) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Activity: Reflection Survey At The Needles Area (DOE GTP) Exploration Activity...

  3. Reflection Survey At Jemez Pueblo Area (DOE GTP) | Open Energy...

    Open Energy Info (EERE)

    Jemez Pueblo Area (DOE GTP) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Activity: Reflection Survey At Jemez Pueblo Area (DOE GTP) Exploration Activity...

  4. Reflection Survey At Wister Area (DOE GTP) | Open Energy Information

    Open Energy Info (EERE)

    Wister Area (DOE GTP) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Activity: Reflection Survey At Wister Area (DOE GTP) Exploration Activity Details...

  5. Reflection Survey At Hot Sulphur Springs Area (Goranson, 2005...

    Open Energy Info (EERE)

    Reflection Survey Activity Date Usefulness useful DOE-funding Unknown References Colin Goranson (2005) Recent Drilling Activities At The Earth Power Resources Tuscarora...

  6. Reflection Survey At Under Steamboat Springs Area (Warpinski...

    Open Energy Info (EERE)

    Reflection Survey Activity Date Usefulness not indicated DOE-funding Unknown Notes Update to Warpinski, et al., 2002 References N. R. Warpinski, A. R. Sattler, R. Fortuna, D....

  7. Seismic Reflection Data and Conceptual Models for Geothermal...

    Open Energy Info (EERE)

    failure of seismic reflection data to image thesubsurface demonstrates the robust reliability of aconceptual model approach to geothermal exploration thatemphasizes the...

  8. Reflection Survey At Snake River Plain Region (DOE GTP) | Open...

    Open Energy Info (EERE)

    Community Login | Sign Up Search Page Edit with form History Reflection Survey At Snake River Plain Region (DOE GTP) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home...

  9. Reflection Survey At Coso Geothermal Area (2008) | Open Energy...

    Open Energy Info (EERE)

    field, which lies within an extensional step-over between dextral faults, is a young, actively developing metamorphic core complex. The reflection images were processed...

  10. A reflective optical transport system for ultraviolet Thomson...

    Office of Scientific and Technical Information (OSTI)

    transport system for ultraviolet Thomson scattering from electron plasma waves on OMEGA Citation Details In-Document Search Title: A reflective optical transport system for ...

  11. Reflection Survey At San Emidio Desert Area (DOE GTP) | Open...

    Open Energy Info (EERE)

    San Emidio Desert Area (DOE GTP) Jump to: navigation, search GEOTHERMAL ENERGYGeothermal Home Exploration Activity: Reflection Survey At San Emidio Desert Area (DOE GTP)...

  12. Synchrotron infrared reflectivity measurements of iron at high pressures

    Office of Scientific and Technical Information (OSTI)

    (Journal Article) | SciTech Connect Journal Article: Synchrotron infrared reflectivity measurements of iron at high pressures Citation Details In-Document Search Title: Synchrotron infrared reflectivity measurements of iron at high pressures The infrared reflectance of iron was studied using high-pressure synchrotron radiation methods up to 50 GPa at room temperature in a diamond anvil cell of 1000-8000 cm{sup -1} (1.25-10 {mu}m). The magnitude of the reflectivity shows a weak pressure

  13. Reflection Survey At Blue Mountain Geothermal Area (Melosh, Et...

    Open Energy Info (EERE)

    model of blue mountain. References Glenn Melosh, William Cumming, John Casteel, Kim Niggemann, Brian Fairbank (2010) Seismic Reflection Data and Conceptual Models for...

  14. Methane production by attached film

    DOE Patents [OSTI]

    Jewell, William J.

    1981-01-01

    A method for purifying wastewater of biodegradable organics by converting the organics to methane and carbon dioxide gases is disclosed, characterized by the use of an anaerobic attached film expanded bed reactor for the reaction process. Dilute organic waste material is initially seeded with a heterogeneous anaerobic bacteria population including a methane-producing bacteria. The seeded organic waste material is introduced into the bottom of the expanded bed reactor which includes a particulate support media coated with a polysaccharide film. A low-velocity upward flow of the organic waste material is established through the bed during which the attached bacterial film reacts with the organic material to produce methane and carbon dioxide gases, purified water, and a small amount of residual effluent material. The residual effluent material is filtered by the film as it flows upwardly through the reactor bed. In a preferred embodiment, partially treated effluent material is recycled from the top of the bed to the bottom of the bed for further treatment. The methane and carbon dioxide gases are then separated from the residual effluent material and purified water.

  15. Thin film polymeric gel electrolytes

    DOE Patents [OSTI]

    Derzon, D.K.; Arnold, C. Jr.; Delnick, F.M.

    1996-12-31

    Novel hybrid thin film electrolytes, based on an organonitrile solvent system, which are compositionally stable, environmentally safe, can be produced efficiently in large quantity and which, because of their high conductivities {approx_equal}10{sup {minus}3}{Omega}{sup {minus}1} cm{sup {minus}1} are useful as electrolytes for rechargeable lithium batteries. 1 fig.

  16. Thin film solar energy collector

    SciTech Connect (OSTI)

    Farrauto, R.J.; Myers, H.; Williams, J.C.

    1982-03-23

    A solar energy collector has improved absorptance and emissivity levels comprising: (1) a silver-copper oxide-rhodium oxide solar absorption film, (2) a cerium oxide interlayer and a substrate of quartz, silica glass or metal. The cerium oxide interlayer minimizes agglomeration of the metal particles, maintains a relatively low thermal emittance and improves overall stability.

  17. Thin film polymeric gel electrolytes

    DOE Patents [OSTI]

    Derzon, Dora K.; Arnold, Jr., Charles; Delnick, Frank M.

    1996-01-01

    Novel hybrid thin film electrolyte, based on an organonitrile solvent system, which are compositionally stable, environmentally safe, can be produced efficiently in large quantity and which, because of their high conductivities .apprxeq.10.sup.-3 .OMEGA..sup.-1 cm.sup.-1 are useful as electrolytes for rechargeable lithium batteries.

  18. Influence of structural disorder on soft x-ray optical behavior of NbC thin films

    SciTech Connect (OSTI)

    Singh, Amol E-mail: rrcat.amol@gmail.com; Modi, Mohammed H.; Sinha, A. K.; Lodha, G. S.; Rajput, Parasmani

    2015-05-07

    Structural and chemical properties of compound materials are modified, when thin films are formed from bulk materials. To understand these changes, a study was pursued on niobium carbide (NbC) thin films of different thicknesses deposited on Si (100) substrate using ion beam sputtering technique. Optical response of the film was measured in 436?nm wavelength region using Indus-1 reflectivity beamline. A discrepancy in soft x-ray performance of NbC film was observed which could not be explained with Henke's tabulated data (see http://henke.lbl.gov/optical{sub c}onstants/ ). In order to understand this, detailed structural and chemical investigations were carried out using x-ray reflectivity, grazing incidence x-ray diffraction, x-ray absorption near edge structure, extended x-ray absorption fine structure, and x-ray photoelectron spectroscopy techniques. It was found that the presence of unreacted carbon and Nb deficiency due to reduced Nb-Nb coordination are responsible for lower soft x-ray reflectivity performance. NbC is an important material for soft x-ray optical devices, hence the structural disorder need to be controlled to achieve the best performances.

  19. Carbon film electrodes for super capacitor applications

    DOE Patents [OSTI]

    Tan, Ming X.

    1999-01-01

    A microporous carbon film for use as electrodes in energy strorage devices is disclosed, which is made by the process comprising the steps of: (1) heating a polymer film material consisting essentially of a copolymer of polyvinylidene chloride and polyvinyl chloride in an inert atmosphere to form a carbon film; and (2) activating said carbon film to form said microporous carbon film having a density between about 0.7 g/cm.sup.2 and 1 g/cm.sup.2 and a gravimetric capacitance of about between 120 F/g and 315 F/g.

  20. Carbon film electrodes for super capacitor applications

    SciTech Connect (OSTI)

    Tan, M.X.

    1999-11-30

    A microporous carbon film for use as electrodes in energy storage devices is disclosed, which is made by the process comprising the steps of: (1) heating a polymer film material consisting essentially of a copolymer of polyvinylidene chloride and polyvinyl chloride in an inert atmosphere to form a carbon film; and (2) activating said carbon film to form said microporous carbon film having a density between about 0.7 g/cm{sup 2} and 1 g/cm{sup 2} and a gravimetric capacitance of about between 120 F/g and 315 F/g.

  1. Method for fabricating hafnia films

    DOE Patents [OSTI]

    Hu, Michael Z [Knoxville, TN

    2007-08-21

    The present invention comprises a method for fabricating hafnia film comprising the steps of providing a substrate having a surface that allows formation of a self-assembled monolayer thereon via covalent bonding; providing an aqueous solution that provides homogeneous hafnium ionic complexes and hafnium nanoclusters wherein the aqueous solution is capable of undergoing homogeneous precipitation under controlled conditions for a desired period of time at a controlled temperature and controlled solution acidity for desired nanocluster nucleation and growth kinetics, desired nanocluster size, desired growth rate of film thickness and desired film surface characteristics. The method further comprising forming the self-assembled monolayer on the surface of the substrate wherein the self-assembled monolayer comprises a plurality of hydrocarbon chains cross-linked together along the surface of the substrate, the hydrocarbon chains being uniformly spaced from one another and wherein each of the hydrocarbon chains having a functional anchoring group at a first end of the chain covalently bonded with the surface of the substrate and each of the hydrocarbon chains having a functional terminating group projected away from the surface wherein the functional terminating group provides a bonding site for the hafnium film to grow; and exposing the substrate to the aqueous solution for a desired period of time at a controlled temperature wherein the hafnium ionic complexes and the hafnium nanoclusters are deposited on the bonding site of the functional terminating group thereby forming the hafnia film wherein the hafnium bonded to the hydrocarbons and to one another provide a uniform ordered arrangement defined by the uniform arrangement of the hydrocarbons.

  2. Big-Data RHEED analysis for understanding epitaxial film growth processes

    SciTech Connect (OSTI)

    Vasudevan, Rama K; Tselev, Alexander; Baddorf, Arthur P; Kalinin, Sergei V

    2014-10-28

    Reflection high energy electron diffraction (RHEED) has by now become a standard tool for in-situ monitoring of film growth by pulsed laser deposition and molecular beam epitaxy. Yet despite the widespread adoption and wealth of information in RHEED image, most applications are limited to observing intensity oscillations of the specular spot, and much additional information on growth is discarded. With ease of data acquisition and increased computation speeds, statistical methods to rapidly mine the dataset are now feasible. Here, we develop such an approach to the analysis of the fundamental growth processes through multivariate statistical analysis of RHEED image sequence. This approach is illustrated for growth of LaxCa1-xMnO3 films grown on etched (001) SrTiO3 substrates, but is universal. The multivariate methods including principal component analysis and k-means clustering provide insight into the relevant behaviors, the timing and nature of a disordered to ordered growth change, and highlight statistically significant patterns. Fourier analysis yields the harmonic components of the signal and allows separation of the relevant components and baselines, isolating the assymetric nature of the step density function and the transmission spots from the imperfect layer-by-layer (LBL) growth. These studies show the promise of big data approaches to obtaining more insight into film properties during and after epitaxial film growth. Furthermore, these studies open the pathway to use forward prediction methods to potentially allow significantly more control over growth process and hence final film quality.

  3. High performance transparent conducting films of cadmium indate prepared by RF sputtering

    SciTech Connect (OSTI)

    Coutts, T.J.; Wu, X.; Mulligan, W.P.

    1996-12-31

    The authors are examining various spinel-structured thin films (e.g., Cd{sub 2}SnO{sub 4}, Zn{sub 2}SnO{sub 4}) to develop higher-quality transparent conducting oxides (TCO) than more conventional materials such as indium tin oxide. Here, they report on cadmium indate (CdIn{sub 2}O{sub 4}, CIO), which is another member of this family. Thin films of CIO were deposited by radio-frequency (RF) magnetron sputtering, from an oxide target, onto borosilicate glass substrates. The variables included the substrate temperature, sputtering gas composition, and pressure. Film properties were measured before and after heat treatment. Characterization involved Hall effect measurements, optical and infrared spectrophotometry, X-ray diffraction, and atomic-force microscopy. Film resistivities as low as 2.3 {times} 10{sup {minus}4} {Omega}cm were achieved for a film thickness of 0.55 {micro}m. The transmittance was 90% in the visible region of the spectrum, without correction for substrate losses and without an anti-reflection coating. The plasma resonance occurred at longer wavelengths than for other materials and this, with a bandgap of approximately 3.1 eV, presents a wide window for optical transmittance. The highest mobility was 54 cm{sup 2} V{sup {minus}1} s{sup {minus}1} and the highest carrier concentration was 7.5 {times} 10{sup 20} cm{sup {minus}3}.

  4. High performance transparent conducting films of cadmium indate prepared by RF sputtering

    SciTech Connect (OSTI)

    Coutts, T.J.; Wu, X.; Mulligan, W.P.

    1996-04-01

    The authors are examining various spinel-structured thin films (e.g., Cd{sub 2}SnO{sub 4}, Zn{sub 2}SnO{sub 4}) to develop higher-quality transparent conducting oxides (TCO) than more conventional materials such as indium tin oxide. Here, the authors report on cadmium indate (CdIn{sub 2}O{sub 4}, CIO), which is another member of this family. Thin films of CIO were deposited by radio-frequency (RF) magnetron sputtering, from an oxide target, onto borosilicate glass substrates. The variables included the substrate temperature, sputtering gas composition, and pressure. Film properties were measured before and after heat treatment. Characterization involved Hall effect measurements, optical and infrared spectrophotometry, X-ray diffraction, and atomic-force microscopy. Film resistivities as low as 2.3 {times} 10{sup {minus}4} {Omega} cm were achieved for a film thickness of 0.55 {micro}m. The transmittance was 90% in the visible region of the spectrum, without correction for substrate losses and without an anti-reflection coating. The plasma resonance occurred at longer wavelengths than for other materials and this, with a bandgap of approximately 3.1 eV, presents a wide window for optical transmittance. The highest mobility was 54 cm{sup 2} V{sup {minus}1} s{sup {minus}1} and the highest carrier concentration was 7.5 {times} 10{sup 20} cm{sup {minus}3}.

  5. Apparatus for and method of correcting for astigmatism in a light beam reflected off of a light reflecting surface

    DOE Patents [OSTI]

    Sawicki, R.H.; Sweatt, W.

    1985-11-21

    A technique for adjustably correcting for astigmatism in a light beam is disclosed herein. This technique defines a flat, rectangular light reflecting surface having opposite reinforced side edges and which is resiliently bendable, to a limited extent, into different concave and/or convex cylindrical curvatures about a particular axis and provides for adjustably bending the light reflecting surface into one of different curvatures depending upon the astigmatism to be corrected and for fixedly maintaining the curvature selected. In the embodiment disclosed, the light reflecting surface is adjustably bendable into the selected cylindrical curvature by application of a particular bending moment to the reinforced side edges of the light reflecting surface.

  6. Field Emission and Nanostructure of Carbon Films

    SciTech Connect (OSTI)

    Merkulov, V.I.; Lowndes, D.H.; Baylor, L.R.

    1999-11-29

    The results of field emission measurements of various forms of carbon films are reported. It is shown that the films nanostructure is a crucial factor determining the field emission properties. In particular, smooth, pulsed-laser deposited amorphous carbon films with both high and low sp3 contents are poor field emitters. This is similar to the results obtained for smooth nanocrystalline, sp2-bonded carbon films. In contrast, carbon films prepared by hot-filament chemical vapor deposition (HE-CVD) exhibit very good field emission properties, including low emission turn-on fields, high emission site density, and excellent durability. HF-CVD carbon films were found to be predominantly sp2-bonded. However, surface morphology studies show that these films are thoroughly nanostructured, which is believed to be responsible for their promising field emission properties.

  7. Carbon Film Electrodes For Super Capacitor Applications

    DOE Patents [OSTI]

    Tan, Ming X.

    1999-07-20

    A method for treating an organic polymer material, preferably a vinylidene chloride/vinyl chloride copolymer (Saran) to produce a flat sheet of carbon film material having a high surface area (.apprxeq.1000 m.sup.2 /g) suitable as an electrode material for super capacitor applications. The method comprises heating a vinylidene chloride/vinyl chloride copolymer film disposed between two spaced apart graphite or ceramic plates to a first temperature of about 160.degree. C. for about 14 hours to form a stabilized vinylidene chloride/vinyl chloride polymer film, thereafter heating the stabilized film to a second temperature of about 750.degree. C. in an inert atmosphere for about one hour to form a carbon film; and finally activating the carbon film to increase the surface area by heating the carbon film in an oxidizing atmosphere to a temperature of at least 750-850.degree. C. for between 1-6 hours.

  8. Reflection soft X-ray microscope and method

    DOE Patents [OSTI]

    Suckewer, Szymon; Skinner, Charles H.; Rosser, Roy

    1993-01-01

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  9. Reflection soft X-ray microscope and method

    DOE Patents [OSTI]

    Suckewer, S.; Skinner, C.H.; Rosser, R.

    1993-01-05

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  10. Parametric reflection upon cascade interaction of focused optical beams

    SciTech Connect (OSTI)

    Lobanov, V E; Sukhorukov, A P; Sukhorukova, A K

    2008-10-31

    The parametric reflection of a signal beam in the waist of the reference pump beam upon mismatched three-frequency interaction in a quadratically nonlinear medium is discussed. The critical angle of total internal reflection from the induced defocusing channel is found as a function of the beam waist parameters. It is shown that when the reference beam is focused, this angle increases and some distortions are introduced into the reflected wave due to a finite length of the waist. The modification of the cross section of a wave reflected from a convex parametric mirror is analysed. The optimal beam focusing geometry is found at which the distortions of the shape and divergence of the reflected wave are minimal. Under certain conditions, the signal wave also flows around a cylindrical inhomogeneity produced by the axially symmetric pump beam. The results of theoretical analysis and numerical simulation are in good agreement. (nonlinear optical phenomena)

  11. Direct Evidence for Abrupt Postcrystallization Germanium Precipitation in Thin Phase-Change Films of Sb-15 at. % Ge

    SciTech Connect (OSTI)

    Cabral,C.; Krusin-Elbaum, L.; Bruley, J.; Raoux, S.; Deline, V.; Madan, A.; Pinto, T.

    2008-01-01

    We present evidence for the instability in the crystalline (metallic) state of binary Te-free phase-change Ge-Sb thin films considered for integration into nonvolatile nanosized memory cells. We find that while the amorphous (semiconducting) phase of eutectic Sb-15 at. % Ge is very robust until Sb crystallization at 240 C, at about 350 C, germanium rapidly precipitates out. Ge precipitation, visualized directly with transmission electron microscopy, is exothermic and is found to affect the films' reflectivity, resistance, and stress. It converts melting into a two-step process, which may seriously impact the switching reliability of a device.

  12. Interdiffusion in nanometric Fe/Ni multilayer films

    SciTech Connect (OSTI)

    Liu, JX; Barmak, K

    2015-03-01

    Fe (3.1 nm)/Ni (3.3 nm)](20) multilayer films were prepared by DC magnetron sputtering onto oxidized Si(100) substrates. The Fe and Ni layers were shown to both be face-centered cubic by x-ray diffraction. Interdiffusion of the Fe and Ni layers in the temperature range of 300-430 degrees C was studied by x-ray reflectivity. From the decay of the integral intensity of the superlattice peak, the activation energy and the pre-exponential term for the effective interdiffusion coefficient were determined as to 1.06 +/- 0.07 eV and 5 x 10(-10) cm(2)/s, respectively. The relevance of the measured interdiffusion coefficient to the laboratory timescale synthesis of L1(0) ordered FeNi as a rare-earth free permanent magnet is discussed. (C) 2015 American Vacuum Society.

  13. Effect of processor temperature on film dosimetry

    SciTech Connect (OSTI)

    Srivastava, Shiv P.; Das, Indra J.

    2012-07-01

    Optical density (OD) of a radiographic film plays an important role in radiation dosimetry, which depends on various parameters, including beam energy, depth, field size, film batch, dose, dose rate, air film interface, postexposure processing time, and temperature of the processor. Most of these parameters have been studied for Kodak XV and extended dose range (EDR) films used in radiation oncology. There is very limited information on processor temperature, which is investigated in this study. Multiple XV and EDR films were exposed in the reference condition (d{sub max.}, 10 Multiplication-Sign 10 cm{sup 2}, 100 cm) to a given dose. An automatic film processor (X-Omat 5000) was used for processing films. The temperature of the processor was adjusted manually with increasing temperature. At each temperature, a set of films was processed to evaluate OD at a given dose. For both films, OD is a linear function of processor temperature in the range of 29.4-40.6 Degree-Sign C (85-105 Degree-Sign F) for various dose ranges. The changes in processor temperature are directly related to the dose by a quadratic function. A simple linear equation is provided for the changes in OD vs. processor temperature, which could be used for correcting dose in radiation dosimetry when film is used.

  14. Photopatternable sorbent and functionalized films

    DOE Patents [OSTI]

    Grate, Jay W.; Nelson, David A.

    2006-01-31

    A composition containing a polymer, a crosslinker and a photo-activatable catalyst is placed on a substrate. The composition is exposed to a predetermined pattern of light, leaving an unexposed region. The light causes the polymer to become crosslinked by hydrosilylation. A solvent is used to remove the unexposed composition from the substrate, leaving the exposed pattern to become a sorbent polymer film that will absorb a predetermined chemical species when exposed to such chemical species.

  15. Deposited films with improved microstructures

    DOE Patents [OSTI]

    Patten, James W.; Moss, Ronald W.; McClanahan, Edwin D.

    1984-01-01

    Methods for improving microstructures of line-of-sight deposited films are described. Columnar growth defects ordinarily produced by geometrical shadowing during deposition of such films are eliminated without resorting to post-deposition thermal or mechanical treatments. The native, as-deposited coating qualities, including homogeneity, fine grain size, and high coating-to-substrate adherence, can thus be retained. The preferred method includes the steps of emitting material from a source toward a substrate to deposit a coating non-uniformly on the substrate surface, removing a portion of the coating uniformly over the surface, again depositing material onto the surface, but from a different direction, and repeating the foregoing steps. The quality of line-of-sight deposited films such as those produced by sputtering, progressively deteriorates as the angle of incidence between the flux and the surface becomes increasingly acute. Depositing non-uniformly, so that the coating becomes progressively thinner as quality deteriorates, followed by uniformly removing some of the coating, such as by resputtering, eliminates the poor quality portions, leaving only high quality portions of the coating. Subsequently sputtering from a different direction applies a high quality coating to other regions of the surface. Such steps can be performed either simultaneously or sequentially to apply coatings of a uniformly high quality, closed microstructure to three-dimensional or large planar surfaces.

  16. Reflective optical imaging system for extreme ultraviolet wavelengths

    DOE Patents [OSTI]

    Viswanathan, Vriddhachalam K.; Newnam, Brian E.

    1993-01-01

    A projection reflection optical system has two mirrors in a coaxial, four reflection configuration to reproduce the image of an object. The mirrors have spherical reflection surfaces to provide a very high resolution of object feature wavelengths less than 200 .mu.m, and preferably less than 100 .mu.m. An image resolution of features less than 0.05-0.1 .mu.m, is obtained over a large area field; i.e., 25.4 mm .times.25.4 mm, with a distortion less than 0.1 of the resolution over the image field.

  17. Reflective optical imaging system for extreme ultraviolet wavelengths

    DOE Patents [OSTI]

    Viswanathan, V.K.; Newnam, B.E.

    1993-05-18

    A projection reflection optical system has two mirrors in a coaxial, four reflection configuration to reproduce the image of an object. The mirrors have spherical reflection surfaces to provide a very high resolution of object feature wavelengths less than 200 [mu]m, and preferably less than 100 [mu]m. An image resolution of features less than 0.05-0.1 [mu]m, is obtained over a large area field; i.e., 25.4 mm [times] 25.4 mm, with a distortion less than 0.1 of the resolution over the image field.

  18. Apparatus to study crystal channeling and volume reflection phenomena at

    Office of Scientific and Technical Information (OSTI)

    the SPS H8 beamline (Journal Article) | SciTech Connect Apparatus to study crystal channeling and volume reflection phenomena at the SPS H8 beamline Citation Details In-Document Search Title: Apparatus to study crystal channeling and volume reflection phenomena at the SPS H8 beamline A high performance apparatus has been designed and built by the H8-RD22 collaboration for the study of channeling and volume reflection phenomena in the interaction of 400 GeV/c protons with bent silicon

  19. Glancing angle deposition of SiO{sub 2} thin film microstructures: Investigations of optical and morphological properties

    SciTech Connect (OSTI)

    Tokas, R. B. E-mail: tokasstar@gmail.com; Jena, S. E-mail: tokasstar@gmail.com; Sarkar, P. E-mail: tokasstar@gmail.com; Thakur, S. E-mail: tokasstar@gmail.com; Sahoo, N. K. E-mail: tokasstar@gmail.com

    2014-04-24

    In present work, the optical and the morphological properties of micro-structured SiO{sub 2} thin films fabricated by using glancing angle deposition (GLAD) technique has been carried out. The results are compared with the normally deposited SiO{sub 2} films for the gained advantages. The influence of the glancing angle on the refractive index of porous SiO{sub 2} film was investigated by the spectral transmission measurement in 400–950 nm wavelength regimes. The refractive index has been found to be 1.14@532 nm for the porous SiO{sub 2} film deposited at a glancing angle of 85°. The density and surface qualities of these samples were primarily investigated by using grazing angle X-ray reflectivity (GIXR) and atomic force microscope (AFM) measurements. Results indicate a substantial decrease in film density and refractive index and increase in surface roughness and grain size for GLAD SiO{sub 2} compared to normally deposited SiO{sub 2} films.

  20. Tuneable dielectric films having low electrical losses

    DOE Patents [OSTI]

    Dimos, Duane Brian; Schwartz, Robert William; Raymond, Mark Victor; Al-Shareef, Husam Niman; Mueller, Carl; Galt, David

    2000-01-01

    The present invention is directed to a method for forming dielectric thin films having substantially reduced electrical losses at microwave and millimeter wave frequencies relative to conventional dielectric thin films. The reduction in losses is realized by dramatically increasing the grain sizes of the dielectric films, thereby minimizing intergranular scattering of the microwave signal due to grain boundaries and point defects. The increase in grain size is realized by heating the film to a temperature at which the grains experience regrowth. The grain size of the films can be further increased by first depositing the films with an excess of one of the compoents, such that a highly mobile grain boundary phase is formed.

  1. Ambient-pressure silica aerogel films

    SciTech Connect (OSTI)

    Prakash, S.S. [New Mexico Univ., Albuquerque, NM (United States); Brinker, C.J. [New Mexico Univ., Albuquerque, NM (United States)]|[Sandia National Labs., Albuquerque, NM (United States); Hurd, A.J. [Sandia National Labs., Albuquerque, NM (United States)

    1994-12-31

    Very highly porous (aerogel) silica films with refractive index in the range 1.006--1.05 (equivalent porosity 98.5--88%) were prepared by an ambient-pressure process. It was shown earlier using in situ ellipsometric imaging that the high porosity of these films was mainly attributable to the dilation or `springback` of the film during the final stage of drying. This finding was irrefutably reconfirmed by visually observing a `springback` of >500% using environmental scanning electron microscopy (ESEM). Ellipsometry and ESEM also established the near cent per cent reversibility of aerogel film deformation during solvent intake and drying. Film thickness profile measurements (near the drying line) for the aerogel, xerogel and pure solvent cases are presented from imaging ellipsometry. The thickness of these films (crack-free) were controlled in the range 0.1-3.5 {mu}m independent of refractive index.

  2. Domain epitaxy for thin film growth

    DOE Patents [OSTI]

    Narayan, Jagdish

    2005-10-18

    A method of forming an epitaxial film on a substrate includes growing an initial layer of a film on a substrate at a temperature T.sub.growth, said initial layer having a thickness h and annealing the initial layer of the film at a temperature T.sub.anneal, thereby relaxing the initial layer, wherein said thickness h of the initial layer of the film is greater than a critical thickness h.sub.c. The method further includes growing additional layers of the epitaxial film on the initial layer subsequent to annealing. In some embodiments, the method further includes growing a layer of the film that includes at least one amorphous island.

  3. Method for forming porous platinum films

    DOE Patents [OSTI]

    Maya, Leon

    2000-01-01

    A method for forming a platinum film includes providing a substrate, sputtering a crystalline platinum oxide layer over at least a portion of the substrate, and reducing the crystalline platinum oxide layer to form the platinum film. A device includes a non-conductive substrate and a platinum layer having a density of between about 2 and 5 g/cm.sup.3 formed over at least a portion of the non-conductive substrate. The platinum films produced in accordance with the present invention provide porous films suitable for use as electrodes, yet require few processing steps. Thus, such films are less costly. Such films may be formed on both conductive and non-conductive substrates. While the invention has been illustrated with platinum, other metals, such as noble metals, that form a low density oxide when reactively sputtered may also be used.

  4. Exploding conducting film laser pumping apparatus

    DOE Patents [OSTI]

    Ware, K.D.; Jones, C.R.

    1984-04-27

    The 342-nm molecular iodine and the 1.315-..mu..m atomic iodine lasers have been optically pumped by intense light from exploding-metal-film discharges. Brightness temperatures for the exploding-film discharges were approximately 25,000 K. Although lower output energies were achieved for such discharges when compared to exploding-wire techniques, the larger surface area and smaller inductance inherent in the exploding-film should lead to improved efficiency for optically-pumped gas lasers.

  5. Electrochemical photovoltaic cell having ternary alloy film

    DOE Patents [OSTI]

    Russak, Michael A.

    1984-01-01

    A thin film compound semiconductor electrode comprising CdSe.sub.1-x Te.sub.x (0.ltoreq.x.ltoreq.1) is deposited on a transparent conductive substrate. An electrolyte contacts the film to form a photoactive site. The semiconductor material has a narrow energy bandgap permitting high efficiency for light conversion. The film may be fabricated by: (1) co-evaporation of two II-VI group compounds with a common cation, or (2) evaporation of three elements, concurrenty.

  6. Method of producing amorphous thin films

    DOE Patents [OSTI]

    Brusasco, Raymond M.

    1992-01-01

    Disclosed is a method of producing thin films by sintering which comprises: a. coating a substrate with a thin film of an inorganic glass forming parulate material possessing the capability of being sintered, and b. irridiating said thin film of said particulate material with a laser beam of sufficient power to cause sintering of said material below the temperature of liquidus thereof. Also disclosed is the article produced by the method claimed.

  7. Polymer-assisted deposition of films

    DOE Patents [OSTI]

    McCleskey, Thomas M.; Burrell; Anthony K.; Jia; Quanxi; Lin; Yuan

    2009-10-20

    A polymer assisted deposition process for deposition of metal oxide films and the like is presented. The process includes solutions of one or more metal precursor and soluble polymers having binding properties for the one or more metal precursor. After a coating operation, the resultant coating is heated at high temperatures to yield metal oxide films and the like. Such films can be epitaxial in structure and can be of optical quality. The process can be organic solvent-free.

  8. Polymer-assisted deposition of films

    DOE Patents [OSTI]

    McCleskey, Thomas M.; Burrell, Anthony K.; Jia, Quanxi; Lin, Yuan

    2008-04-29

    A polymer assisted deposition process for deposition of metal oxide films is presented. The process includes solutions of one or more metal precursor and soluble polymers having binding properties for the one or more metal precursor. After a coating operation, the resultant coating is heated at high temperatures to yield metal oxide films. Such films can be epitaxial in structure and can be of optical quality. The process can be organic solvent-free.

  9. Sputtered Thin Film Photovoltaics - Energy Innovation Portal

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Solar Photovoltaic Solar Photovoltaic Find More Like This Return to Search Sputtered Thin Film Photovoltaics Naval Research Laboratory Contact NRL About This Technology Publications: PDF Document Publication SputteringThinFilmPhotovoltaics (81 KB) Technology Marketing SummaryThe Naval Research Laboratory (NRL) has developed a suite of processes for the fabrication of bulk and sputtered thin film copper indium gallium diselenide (CIGS) and related materials for photovoltaic (PV)

  10. Anisotropic conducting films for electromagnetic radiation applications

    DOE Patents [OSTI]

    Cavallo, Francesca; Lagally, Max G.; Rojas-Delgado, Richard

    2015-06-16

    Electronic devices for the generation of electromagnetic radiation are provided. Also provided are methods for using the devices to generate electromagnetic radiation. The radiation sources include an anisotropic electrically conducting thin film that is characterized by a periodically varying charge carrier mobility in the plane of the film. The periodic variation in carrier mobility gives rise to a spatially varying electric field, which produces electromagnetic radiation as charged particles pass through the film.

  11. NREL: Technology Transfer - NREL and SkyFuel Partnership Reflects...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    NREL and SkyFuel Partnership Reflects Bright Future for Solar Energy In this video, NREL Principal Scientist Gary Jorgensen and SkyFuel Chief Technology Officer Randy Gee talk...

  12. Anti-reflective nanoporous silicon for efficient hydrogen production

    DOE Patents [OSTI]

    Oh, Jihun; Branz, Howard M

    2014-05-20

    Exemplary embodiments are disclosed of anti-reflective nanoporous silicon for efficient hydrogen production by photoelectrolysis of water. A nanoporous black Si is disclosed as an efficient photocathode for H.sub.2 production from water splitting half-reaction.

  13. Measuring solar reflectance Part I: Defining a metric that accurately...

    Office of Scientific and Technical Information (OSTI)

    A widely used solar reflectance metric based on the ASTM Standard E891 beam-normal solar spectral irradiance underestimates the solar heat gain of a spectrally selective 'cool ...

  14. High order reflectivity of graphite (HOPG) crystals for x ray...

    Office of Scientific and Technical Information (OSTI)

    In second order the integrated reflectivity decreases from 1.3 mrad at 12.6 keV to ... Country of Publication: United States Language: English Subject: 70 PLASMA PHYSICS AND FUSION; ...

  15. Measuring solar reflectance Part II: Review of practical methods...

    Office of Scientific and Technical Information (OSTI)

    solar position, and found that clear sky air mass 1 global horizontal (AM1GH) solar ... Rsub g,0more to within 0.006. The air mass 1.5 solar reflectance measured with ...

  16. Exploding conducting film laser pumping apparatus

    DOE Patents [OSTI]

    Ware, Kenneth D.; Jones, Claude R.

    1986-01-01

    Exploding conducting film laser optical pumping apparatus. The 342-nm molecular iodine and the 1.315-.mu.m atomic iodine lasers have been optically pumped by intense light from exploding-metal-film discharges. Brightness temperatures for the exploding-film discharges were approximately 25,000 K. Although lower output energies were achieved for such discharges when compared to exploding-wire techniques, the larger surface area and smaller inductance inherent in the exploding-film should lead to improved efficiency for optically-pumped gas lasers.

  17. Polymer-assisted deposition of films

    DOE Patents [OSTI]

    McCleskey,Thomas M.; Burrell,Anthony K.; Jia,Quanxi; Lin,Yuan

    2012-02-28

    A polymer assisted deposition process for deposition of metal nitride films and the like is presented. The process includes solutions of one or more metal precursor and soluble polymers having binding properties for the one or more metal precursor. After a coating operation, the resultant coating is heated at high temperatures under a suitable atmosphere to yield metal nitride films and the like. Such films can be conformal on a variety of substrates including non-planar substrates. In some instances, the films can be epitaxial in structure and can be of optical quality. The process can be organic solvent-free.

  18. Applied Films Corporation | Open Energy Information

    Open Energy Info (EERE)

    Place: Longmont, Colorado Zip: 80504 Sector: Services, Solar Product: Provider of thin film deposition equipment and services, particularly to the solar industry....

  19. BPA shares new collection of historical films

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Transmission Line" (1950), a richly detailed film about power engineering that uses animation, tower models and field footage to show how Bonneville built the largest...

  20. Integrated X-Ray Reflectivity Measurements for Elliptically Curved PET

    Office of Scientific and Technical Information (OSTI)

    Crystals (Conference) | SciTech Connect Integrated X-Ray Reflectivity Measurements for Elliptically Curved PET Crystals Citation Details In-Document Search Title: Integrated X-Ray Reflectivity Measurements for Elliptically Curved PET Crystals Spectroscopy provides valuable information about the temperature and density of a compressed pellet in a plasma. Elliptically curved pentaerythritol (PET) crystals are used as components for spectrometers. Their elliptical geometry gives several

  1. Integrated X-ray Reflectivity Measurements for Elliptically Curved PET

    Office of Scientific and Technical Information (OSTI)

    Crystals (Conference) | SciTech Connect ray Reflectivity Measurements for Elliptically Curved PET Crystals Citation Details In-Document Search Title: Integrated X-ray Reflectivity Measurements for Elliptically Curved PET Crystals The elliptically curved pentaerythritol (PET) crystals used in the Supersnout 2 X-ray spectrometer on the National Ignition Facility (NIF) at Lawrence Livermore National Laboratory (LLNL) have been calibrated photometrically in the range of 5.5 to 16 keV. The

  2. Measurement of reflectivity of spherically bent crystals using Kα signal

    Office of Scientific and Technical Information (OSTI)

    from hot electrons produced by laser-matter interaction (Journal Article) | SciTech Connect Measurement of reflectivity of spherically bent crystals using Kα signal from hot electrons produced by laser-matter interaction Citation Details In-Document Search Title: Measurement of reflectivity of spherically bent crystals using Kα signal from hot electrons produced by laser-matter interaction In an experiment at the laser facility ECLIPSE of the CELIA laboratory, University of Bordeaux, we

  3. Signal Post-processing and Reflectivity Calibration of the Atmospheric

    Office of Scientific and Technical Information (OSTI)

    Radiation Measurement Program 915 MHz Wind Profilers (Journal Article) | SciTech Connect Signal Post-processing and Reflectivity Calibration of the Atmospheric Radiation Measurement Program 915 MHz Wind Profilers Citation Details In-Document Search Title: Signal Post-processing and Reflectivity Calibration of the Atmospheric Radiation Measurement Program 915 MHz Wind Profilers Authors: Tridon F. ; Luke E. ; Battaglia, A. ; Kollias, P. ; Williams, C. R. Publication Date: 2013-06-01 OSTI

  4. Repetitive output laser system and method using target reflectivity

    DOE Patents [OSTI]

    Johnson, Roy R.

    1978-01-01

    An improved laser system and method for implosion of a thermonuclear fuel pellet in which that portion of a laser pulse reflected by the target pellet is utilized in the laser system to initiate a succeeding target implosion, and in which the energy stored in the laser system to amplify the initial laser pulse, but not completely absorbed thereby, is used to amplify succeeding laser pulses initiated by target reflection.

  5. Reflected beam illumination microscopy using a microfluidics device -

    Office of Scientific and Technical Information (OSTI)

    progress report 6/15/2014. (Technical Report) | SciTech Connect Technical Report: Reflected beam illumination microscopy using a microfluidics device - progress report 6/15/2014. Citation Details In-Document Search Title: Reflected beam illumination microscopy using a microfluidics device - progress report 6/15/2014. Abstract not provided. Authors: James, Conrad D. ; Finnegan, Patrick Sean ; Renzi, Ronald F. Publication Date: 2014-06-01 OSTI Identifier: 1171452 Report Number(s):

  6. Reflectance spectroscopy for high-speed temperature measurements.

    Office of Scientific and Technical Information (OSTI)

    (Conference) | SciTech Connect SciTech Connect Search Results Conference: Reflectance spectroscopy for high-speed temperature measurements. Citation Details In-Document Search Title: Reflectance spectroscopy for high-speed temperature measurements. Abstract not provided. Authors: Dolan, Daniel H., ; Seagle, Christopher T ; Ao, Tommy ; Herrmann, Mark Publication Date: 2013-05-01 OSTI Identifier: 1106087 Report Number(s): SAND2013-3898C 465305 DOE Contract Number: AC04-94AL85000 Resource Type:

  7. Rapid Solar Mirror Characterization with Fringe Reflection Techniques -

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Energy Innovation Portal Thermal Solar Thermal Energy Analysis Energy Analysis Find More Like This Return to Search Rapid Solar Mirror Characterization with Fringe Reflection Techniques SOFAST: Sandia Optical Fringe Analysis Slope Tool Sandia National Laboratories Contact SNL About This Technology Publications: PDF Document Publication Market Sheet (834 KB) SOFAST Imaging SOFAST Imaging Technology Marketing SummaryThis technology is an automated system in which the reflection of a mirror,

  8. Bidirectional Reflection Distribution Functions from surface bump maps

    SciTech Connect (OSTI)

    Cabral, B.K.

    1988-06-17

    The interaction of light and matter define what we see. This interaction can be characterized by a function which relates incoming light to the distribution of outgoing or reflected light. The Bidirectional Reflection Distribution Function (BRDF) is just such a function. Computer graphics scientists attempting to model this function have made simplifying assumptions about the reflecting surfaces. These simpler models have produced adequate results but only handle very uniform or isotropic surface characteristics. Reality on the other hand is filled with a variety of surface textures which result in a variety of BRDFs. This thesis broadens the class of BRDFs which can be used in computer graphics to render objects more realistically. It presents two enhancements to previous work done by the author. First, it describes a method for the approximation of surface absorption of light through the use of a computed geometric attentuation factor. This factor is computed by calculating the parts of the surface which are visible in the incident and reflecting directions. Specifically, it describes the algorithms and theory behind the visibility calculations and how it affects the reflection properties of the surface. Second, it describes a method for computing Fresnel's Law for conducting and dielectric surface materials and how Fresnel's Law affects surface reflectivity. This work also presents a method for rendering objects using the computed BRDFs. 38 refs., 29 figs., 2 tabs.

  9. Entanglement entropy in quantum spin chains with broken reflection symmetry

    SciTech Connect (OSTI)

    Kadar, Zoltan; Zimboras, Zoltan

    2010-09-15

    We investigate the entanglement entropy of a block of L sites in quasifree translation-invariant spin chains concentrating on the effect of reflection-symmetry breaking. The Majorana two-point functions corresponding to the Jordan-Wigner transformed fermionic modes are determined in the most general case; from these, it follows that reflection symmetry in the ground state can only be broken if the model is quantum critical. The large L asymptotics of the entropy are calculated analytically for general gauge-invariant models, which have, until now, been done only for the reflection-symmetric sector. Analytical results are also derived for certain nongauge-invariant models (e.g., for the Ising model with Dzyaloshinskii-Moriya interaction). We also study numerically finite chains of length N with a nonreflection-symmetric Hamiltonian and report that the reflection symmetry of the entropy of the first L spins is violated but the reflection-symmetric Calabrese-Cardy formula is recovered asymptotically. Furthermore, for noncritical reflection-symmetry-breaking Hamiltonians, we find an anomaly in the behavior of the saturation entropy as we approach the critical line. The paper also provides a concise but extensive review of the block-entropy asymptotics in translation-invariant quasifree spin chains with an analysis of the nearest-neighbor case and the enumeration of the yet unsolved parts of the quasifree landscape.

  10. Optically resonant subwavelength films for tamper-indicating tags and seals

    SciTech Connect (OSTI)

    Alvine, Kyle J.; Suter, Jonathan D.; Bernacki, Bruce E.; Bennett, Wendy D.

    2015-05-23

    We present the design, modeling and performance of a proof-of-concept tamper indicating approach that exploits newly-developed subwavelength-patterned films. These films have a nanostructure-dependent resonant optical reflection that is wavelength, angle, and polarization dependent. As such, they can be tailored to fabricate overlay transparent films for tamper indication and authentication of sensitive or controlled materials not possible with currently-known technologies. An additional advantage is that the unique optical signature is dictated by the geometry and fabrication process of the nanostructures in the film, rather than on the material used. The essential structure unit in the subwavelength resonant coating is a nanoscale Open-Ring Resonator (ORR). This building block is fabricated by coating a dielectric nanoscale template with metal to form a hemispherical shell-like structure. This curved metallic shell structure has a cross-section with an intrinsic capacitance and inductance and is thus the optical equivalent to the well-known “LC” circuit where the capacitance and inductance are determined by the nanoshell dimensions. For structures with sub 100 nm scale, this resonance occurs in the visible electromagnetic spectrum, and in the IR for larger shells. Tampering of the film would be visible though misalignment of the angular dependence of the features in the film. It is additionally possible to add in intrinsic oxidation and strain sensitive matrix materials to further complicate tamper repair and counterfeiting. Cursory standoff readout would be relatively simple using a combination of a near-infrared (or visible) LED flashlight and polarizer or passively using room lighting illumination and a dispersive detector.

  11. High Temperature Thin Film Polymer Dielectric Based Capacitors for HEV

    Broader source: Energy.gov (indexed) [DOE]

    Power Electronic Systems | Department of Energy apep_05_dirk.pdf More Documents & Publications High Temperature Polymer Capacitor Dielectric Films High Temperature Polymer Capacitor Dielectric Films High Temperature Polymer Capacitor Dielectric Films

  12. Apparatus for and method of correcting for astigmatism in a light beam reflected off of a light reflecting surface

    DOE Patents [OSTI]

    Sawicki, Richard H.; Sweatt, William

    1987-01-01

    A technique for adjustably correcting for astigmatism in a light beam is disclosed herein. This technique utilizes first means which defines a flat, rectangular light reflecting surface having opposite reinforced side edges and which is resiliently bendable, to a limited extent, into different concave and/or convex cylindrical curvatures about a particular axis and second means acting on the first means for adjustably bending the light reflecting surface into a particular selected one of the different curvatures depending upon the astigmatism to be corrected for and for fixedly maintaining the curvature selected. In the embodiment disclosed, the light reflecting surface is adjustably bendable into the selected cylindrical curvature by application of a particular bending moment to the reinforced side edges of the light reflecting surface.

  13. The influence of Cd doping on the microstructure and optical properties of nanocrystalline copper ferrite thin films

    SciTech Connect (OSTI)

    El-Hagary, M.; Matar, A.; Shaaban, E.R.; Emam-Ismail, M.

    2013-06-01

    Highlights: ? The structural and optical properties of Cu{sub 1?x}Cd{sub x}Fe{sub 2}O{sub 4} thin films were studied. ? The micro structural parameters of the films have been determined. ? The room temperature reflectance and transmittance data are analyzed. ? The refractive index and energy gap are determined. ? The single oscillator parameters were calculated. - Abstract: Nanocrystalline thin films of mixed CuCd ferrites, Cu{sub 1?x}Cd{sub x}Fe{sub 2}O{sub 4} (x = 0, 0.2, 0.3, 0.5, 0.7, 0.8, 0.9 and 1), were deposited by electron beam evaporation technique. The films were annealed at 450 C for 1 h. The effect of Cd doping on the structural and optical properties of the deposited films has been investigated by using X-ray diffraction (XRD) and optical spectrophotometry. XRD patterns of the annealed films show spinal cubic structure. The lattice parameter was found to increase with the increase of cadmium concentration. The crystallite size of the films was found to vary from 8 nm to 30 nm. The optical transition was found to be direct and indirect transitions with energy gaps decrease from 2.466 (x = 0) to 2.00 (x = 1) eV and from 2.148 (x = 0) to 1.824 (x = 1) eV, respectively. The refractive index dispersion of the films was found to increase with Cd content and discussed in terms of the WempleDiDomenico single oscillator model.

  14. Depth-dependent magnetism in epitaxial MnSb thin films: effects of surface passivation and cleaning

    SciTech Connect (OSTI)

    Aldous J. D.; Sanchez-Hanke C.; Burrows, C.W.; Maskery, I.; Brewer, M.S.; Hase, T.P.A.; Duffy, J.A.; Lees, M. Rs; Decoster, T.; Theis, W.; Quesada, A.; Schmid, A.K.; Bell, G.R.

    2012-03-15

    Depth-dependent magnetism in MnSb(0001) epitaxial films has been studied by combining experimental methods with different surface specificities: polarized neutron reflectivity, x-ray magnetic circular dichroism (XMCD), x-ray resonant magnetic scattering and spin-polarized low energy electron microscopy (SPLEEM). A native oxide {approx}4.5 nm thick covers air-exposed samples which increases the film's coercivity. HCl etching efficiently removes this oxide and in situ surface treatment of etched samples enables surface magnetic contrast to be observed in SPLEEM. A thin Sb capping layer prevents oxidation and preserves ferromagnetism throughout the MnSb film. The interpretation of Mn L{sub 3,2} edge XMCD data is discussed.

  15. An improved thin film approximation to accurately determine the optical conductivity of graphene from infrared transmittance

    SciTech Connect (OSTI)

    Weber, J. W.; Bol, A. A. [Department of Applied Physics, Eindhoven University of Technology, Den Dolech 2, P.O. Box 513, 5600 MB Eindhoven (Netherlands); Sanden, M. C. M. van de [Department of Applied Physics, Eindhoven University of Technology, Den Dolech 2, P.O. Box 513, 5600 MB Eindhoven (Netherlands); Dutch Institute for Fundamental Energy Research (DIFFER), Nieuwegein (Netherlands)

    2014-07-07

    This work presents an improved thin film approximation to extract the optical conductivity from infrared transmittance in a simple yet accurate way. This approximation takes into account the incoherent reflections from the backside of the substrate. These reflections are shown to have a significant effect on the extracted optical conductivity and hence on derived parameters as carrier mobility and density. By excluding the backside reflections, the error for these parameters for typical chemical vapor deposited (CVD) graphene on a silicon substrate can be as high as 17% and 45% for the carrier mobility and density, respectively. For the mid- and near-infrared, the approximation can be simplified such that the real part of the optical conductivity is extracted without the need for a parameterization of the optical conductivity. This direct extraction is shown for Fourier transform infrared (FTIR) transmittance measurements of CVD graphene on silicon in the photon energy range of 3707000?cm{sup ?1}. From the real part of the optical conductivity, the carrier density, mobility, and number of graphene layers are determined but also residue, originating from the graphene transfer, is detected. FTIR transmittance analyzed with the improved thin film approximation is shown to be a non-invasive, easy, and accurate measurement and analysis method for assessing the quality of graphene and can be used for other 2-D materials.

  16. Reflection thermal diffuse x-ray scattering for quantitative determination of phonon dispersion relations

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Mei, A. B.; Hellman, O.; Schlepuetz, C. M.; Rockett, A.; Chiang, T. -C.; Hultman, L.; Petrov, I.; Greene, J. E.

    2015-11-03

    Synchrotron reflection x-ray thermal diffuse scattering (TDS) measurements, rather than previously reported transmission TDS, are carried out at room temperature and analyzed using a formalism based upon second-order interatomic force constants and long-range Coulomb interactions to obtain quantitative determinations of MgO phonon dispersion relations (h) over bar omega(j) (q), phonon densities of states g((h) over bar omega), and isochoric temperature-dependent vibrational heat capacities cv (T). We use MgO as a model system for investigating reflection TDS due to its harmonic behavior as well as its mechanical and dynamic stability. Resulting phonon dispersion relations and densities of states are found tomore » be in good agreement with independent reports from inelastic neutron and x-ray scattering experiments. Temperature-dependent isochoric heat capacities cv (T), computed within the harmonic approximation from (h) over bar omega(j) (q) values, increase with temperature from 0.4 x 10-4 eV/atom K at 100 K to 1.4 x 10-4 eV/atom K at 200 K and 1.9 x 10-4 eV/atom K at 300 K, in excellent agreement with isobaric heat capacity values cp (T) between 4 and 300 K. We anticipate that the experimental approach developed here will be valuable for determining vibrational properties of heteroepitaxial thin films since the use of grazing-incidence (θ ≲ θc where θc is the density-dependent critical angle) allows selective tuning of x-ray penetration depths to ≲ 10 nm.« less

  17. Photobiomolecular metallic particles and films

    DOE Patents [OSTI]

    Hu, Zhong-Cheng

    2003-05-06

    The method of the invention is based on the unique electron-carrying function of a photocatalytic unit such as the photosynthesis system I (PSI) reaction center of the protein-chlorophyll complex isolated from chloroplasts. The method employs a photo-biomolecular metal deposition technique for precisely controlled nucleation and growth of metallic clusters/particles, e.g., platinum, palladium, and their alloys, etc., as well as for thin-film formation above the surface of a solid substrate. The photochemically mediated technique offers numerous advantages over traditional deposition methods including quantitative atom deposition control, high energy efficiency, and mild operating condition requirements.

  18. Surface and bulk crystallization of amorphous solid water films: Confirmation of “top-down” crystallization

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Yuan, Chunqing; Smith, R. Scott; Kay, Bruce D.

    2016-01-11

    Here, the crystallization kinetics of nanoscale amorphous solid water (ASW) films are investigated using temperature-programmed desorption (TPD) and reflection absorption infrared spectroscopy (RAIRS). TPD measurements are used to probe surface crystallization and RAIRS measurements are used to probe bulk crystallization. Isothermal TPD results show that surface crystallization is independent of the film thickness (from 100 to 1000 ML). Conversely, the RAIRS measurements show that the bulk crystallization time increases linearly with increasing film thickness. These results suggest that nucleation and crystallization begin at the ASW/vacuum interface and then the crystallization growth front propagates linearly into the bulk. This mechanism wasmore » confirmed by selective placement of an isotopic layer (5% D2O in H2O) at various positions in an ASW (H2O) film. In this case, the closer the isotopic layer was to the vacuum interface, the earlier the isotopic layer crystallized. These experiments provide direct evidence to confirm that ASW crystallization in vacuum proceeds by a “top-down” crystallization mechanism.« less

  19. Growth and Surface Modification of LaFeO3 Thin Films Induced By Reductive Annealing

    SciTech Connect (OSTI)

    Flynn, Brendan T.; Zhang, Hongliang; Shutthanandan, V.; Varga, Tamas; Colby, Robert J.; Oleksak, Richard P.; Manandhar, Sandeep; Engelhard, Mark H.; Chambers, Scott A.; Henderson, Michael A.; Herman, Gregory S.; Thevuthasan, Suntharampillai

    2015-03-01

    The electronic and ionic conductivity of perovskite oxides has enabled their use in diverse applications such as automotive exhaust catalysts, solid oxide fuel cell cathodes, and visible light photocatalysts. The redox chemistry at the surface of perovskite oxides is largely dependent on the oxidation state of the metal cations as well as the oxide surface stoichiometry. In this study, LaFeO3 (LFO) thin films grown on yttria-stabilized zirconia (YSZ) was characterized using both bulk and surface sensitive techniques. A combination of in situ reflection high energy electron diffraction (RHEED), x-ray diffraction (XRD), transmission electron microscopy (TEM) and Rutherford backscattering spectrometry (RBS) demonstrated that the film is highly oriented and stoichiometric. The film was annealed in an ultra-high vacuum chamber to simulate reducing conditions and studied by angle-resolved x-ray photoelectron spectroscopy (XPS). Iron was found to exist as Fe(0), Fe(II), and Fe(III) depending on the annealing conditions and the depth within the film. A decrease in the concentration of surface oxygen species was correlated with iron reduction. These results should help guide and enhance the design of perovskite materials for catalysts.

  20. Polarity compensation in ultra-thin films of complex oxides: The case of a perovskite nickelate

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Middey, S.; Rivero, P.; Meyers, D.; Kareev, M.; Liu, X.; Cao, Y.; Freeland, J. W.; Barraza-Lopez, S.; Chakhalian, J.

    2014-10-29

    We address the fundamental issue of growth of perovskite ultra-thin films under the condition of a strong polar mismatch at the heterointerface exemplified by the growth of a correlated metal LaNiO3 on the band insulator SrTiO3 along the pseudo cubic [111] direction. While in general the metallic LaNiO3 film can effectively screen this polarity mismatch, we establish that in the ultra-thin limit, films are insulating in nature and require additional chemical and structural reconstruction to compensate for such mismatch. A combination of in-situ reflection high-energy electron diffraction recorded during the growth, X-ray diffraction, and synchrotron based resonant X-ray spectroscopy revealmore » the formation of a chemical phase La2Ni2O5 (Ni2+) for a few unit-cell thick films. First-principles layer-resolved calculations of the potential energy across the nominal LaNiO3/SrTiO3 interface confirm that the oxygen vacancies can efficiently reduce the electric field at the interface.« less

  1. Polarity compensation in ultra-thin films of complex oxides: The case of a perovskite nickelate

    SciTech Connect (OSTI)

    Middey, S.; Rivero, P.; Meyers, D.; Kareev, M.; Liu, X.; Cao, Y.; Freeland, J. W.; Barraza-Lopez, S.; Chakhalian, J.

    2014-10-29

    We address the fundamental issue of growth of perovskite ultra-thin films under the condition of a strong polar mismatch at the heterointerface exemplified by the growth of a correlated metal LaNiO3 on the band insulator SrTiO3 along the pseudo cubic [111] direction. While in general the metallic LaNiO3 film can effectively screen this polarity mismatch, we establish that in the ultra-thin limit, films are insulating in nature and require additional chemical and structural reconstruction to compensate for such mismatch. A combination of in-situ reflection high-energy electron diffraction recorded during the growth, X-ray diffraction, and synchrotron based resonant X-ray spectroscopy reveal the formation of a chemical phase La2Ni2O5 (Ni2+) for a few unit-cell thick films. First-principles layer-resolved calculations of the potential energy across the nominal LaNiO3/SrTiO3 interface confirm that the oxygen vacancies can efficiently reduce the electric field at the interface.

  2. Tailoring the index of refraction of nanocrystalline hafnium oxide thin films

    SciTech Connect (OSTI)

    Vargas, Mirella; Murphy, N. R.; Ramana, C. V.

    2014-03-10

    Hafnium oxide (HfO{sub 2}) films were grown by sputter-deposition by varying the growth temperature (T{sub s} = 25–700 °C). HfO{sub 2} films grown at T{sub s} < 200 °C were amorphous, while those grown at T{sub s} ≥ 200 °C were monoclinic, nanocrystalline with (1{sup ¯}11) texturing. X-ray reflectivity (XRR) analyses indicate that the film-density (ρ) increases with increasing T{sub s}. The index of refraction (n) profiles derived from spectroscopic ellipsometry analyses follow the Cauchy dispersion relation. Lorentz-Lorenz analysis (n{sub (λ)} = 550 nm) and optical-model adopted agree well with the XRR data/analyses. A direct T{sub s}-ρ-n relationship suggests that tailoring the optical quality is possible by tuning T{sub s} and the microstructure of HfO{sub 2} films.

  3. Robust topological surface state in Kondo insulator SmB{sub 6} thin films

    SciTech Connect (OSTI)

    Yong, Jie Jiang, Yeping; Zhang, Xiaohang; Greene, Richard L.; Usanmaz, Demet; Curtarolo, Stefano; Li, Linze; Pan, Xiaoqing; Shin, Jongmoon; Takeuchi, Ichiro

    2014-12-01

    Fabrication of smooth thin films of topological insulators with true insulating bulk are extremely important for utilizing their novel properties in quantum and spintronic devices. Here, we report the growth of crystalline thin films of SmB{sub 6}, a topological Kondo insulator with true insulating bulk, by co-sputtering both SmB{sub 6} and B targets. X-ray diffraction, Raman spectroscopy, and transmission electron microscopy indicate films that are polycrystalline with a (001) preferred orientation. When cooling down, resistivity ρ shows an increase around 50 K and saturation below 10 K, consistent with the opening of the hybridization gap and surface dominated transport, respectively. The ratio ρ{sub 2K}/ρ{sub 300K} is only about two, much smaller than that of bulk, which indicates a much larger surface-to-bulk ratio. Point contact spectroscopy using a superconductor tip on SmB{sub 6} films shows both a Kondo Fano resonance and Andeev reflection, indicating an insulating Kondo lattice with metallic surface states.

  4. Production and characterization of thin film group IIIB, IVB...

    Office of Scientific and Technical Information (OSTI)

    thin film group IIIB, IVB and rare earth hydrides by reactive evaporation Citation Details In-Document Search Title: Production and characterization of thin film group IIIB, IVB ...

  5. Quick, Efficient Film Deposition for Nanomaterials - Energy Innovation...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Quick, Efficient Film Deposition for Nanomaterials Oak Ridge National Laboratory Contact ORNL About This Technology Publications: PDF Document Publication Quick, Efficient Film ...

  6. Low-temperature plasma-deposited silicon epitaxial films: Growth...

    Office of Scientific and Technical Information (OSTI)

    Low-temperature plasma-deposited silicon epitaxial films: Growth and properties Citation Details In-Document Search Title: Low-temperature plasma-deposited silicon epitaxial films:...

  7. Partial Shade Stress Test for Thin-Film Photovoltaic Modules...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Partial Shade Stress Test for Thin-Film Photovoltaic Modules Preprint Timothy J. ... Partial shade stress test for thin-film photovoltaic modules Timothy J Silverman , ...

  8. Vehicle Technologies Office Merit Review 2015: Analysis of Film...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Analysis of Film Formation Chemistry on Silicon Anodes by Advanced In Situ and Operando Vibrational Spectroscopy Vehicle Technologies Office Merit Review 2015: Analysis of Film ...

  9. Multilayer Thin-Film Thermoelectric Materials for Vehicle Applications...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Multilayer Thin-Film Thermoelectric Materials for Vehicle Applications Multilayer Thin-Film Thermoelectric Materials for Vehicle Applications 2004 Diesel Engine Emissions Reduction ...

  10. Partial Shading in Monolithic Thin Film PV Modules: Analysis...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Partial Shading in Monolithic Thin Film PV Modules: Analysis and Design Partial Shading in Monolithic Thin Film PV Modules: Analysis and Design Presented at the PV Module ...

  11. Precursors for the polymer-assisted deposition of films (Patent...

    Office of Scientific and Technical Information (OSTI)

    Precursors for the polymer-assisted deposition of films Citation Details In-Document Search Title: Precursors for the polymer-assisted deposition of films A polymer assisted ...

  12. Development of a Low Cost Ultra Specular Advanced Polymer Film...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Low Cost Ultra Specular Advanced Polymer Film Solar Reflector Development of a Low Cost Ultra Specular Advanced Polymer Film Solar Reflector This presentation was delivered at the ...

  13. High Temperature Thin Film Polymer Dielectric Based Capacitors...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Thin Film Polymer Dielectric Based Capacitors for HEV Power Electronic Systems High Temperature Thin Film Polymer Dielectric Based Capacitors for HEV Power Electronic Systems 2009 ...

  14. Epitaxial ternary nitride thin films prepared by a chemical solution...

    Office of Scientific and Technical Information (OSTI)

    Epitaxial ternary nitride thin films prepared by a chemical solution method Citation Details In-Document Search Title: Epitaxial ternary nitride thin films prepared by a chemical ...

  15. Solvothermal Thin Film Deposition of Electron Blocking Layers...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Solvothermal Thin Film Deposition of Electron Blocking Layers Home > Research > ANSER Research Highlights > Solvothermal Thin Film Deposition of Electron Blocking Layers...

  16. China Lucky Film Co Ltd | Open Energy Information

    Open Energy Info (EERE)

    Lucky Film Co Ltd Jump to: navigation, search Name: China Lucky Film Co Ltd Place: Baoding, Hebei Province, China Zip: 71054 Sector: Solar Product: China's photosensitive materials...

  17. Solar Thin Films Inc formerly American United Global Inc | Open...

    Open Energy Info (EERE)

    Films Inc formerly American United Global Inc Jump to: navigation, search Name: Solar Thin Films Inc (formerly American United Global Inc) Place: New York, New York Zip: 10038...

  18. SFC Ltd formerly SamWoo Film | Open Energy Information

    Open Energy Info (EERE)

    Solar Product: Korean manufacturer of various types of film, including light diffusion, printing, OHP, inkjet films and TPT-type backsheets for solar modules. Coordinates:...

  19. Semiconductor-nanocrystal/conjugated polymer thin films (Patent...

    Office of Scientific and Technical Information (OSTI)

    Semiconductor-nanocrystalconjugated polymer thin films Citation Details In-Document Search Title: Semiconductor-nanocrystalconjugated polymer thin films You are accessing a...

  20. Radiochromic Film Measurement of Spatial Uniformity for a Laser...

    Office of Scientific and Technical Information (OSTI)

    Radiochromic Film Measurement of Spatial Uniformity for a Laser Generated X-ray Environment Citation Details In-Document Search Title: Radiochromic Film Measurement of Spatial...

  1. Stress evolution during electrodeposition of Ni thin films. ...

    Office of Scientific and Technical Information (OSTI)

    Conference: Stress evolution during electrodeposition of Ni thin films. Citation Details In-Document Search Title: Stress evolution during electrodeposition of Ni thin films. ...

  2. Diamond film growth argon-carbon plasmas

    DOE Patents [OSTI]

    Gruen, Dieter M. (Downers Grove, IL); Krauss, Alan R. (Naperville, IL); Liu, Shengzhong (Canton, MI); Pan, Xianzheng (Wuhan Hubei, CN); Zuiker, Christopher D. (LaGrange, IL)

    1998-01-01

    A method and system for manufacturing diamond film. The method involves forming a carbonaceous vapor, providing a gas stream of argon, hydrogen and hydrocarbon and combining the gas with the carbonaceous vapor, passing the combined carbonaceous vapor and gas carrier stream into a chamber, forming a plasma in the chamber causing fragmentation of the carbonaceous and deposition of a diamond film on a substrate.

  3. Preparation of a semiconductor thin film

    DOE Patents [OSTI]

    Pehnt, M.; Schulz, D.L.; Curtis, C.J.; Ginley, D.S.

    1998-01-27

    A process is disclosed for the preparation of a semiconductor film. The process comprises depositing nanoparticles of a semiconductor material onto a substrate whose surface temperature during nanoparticle deposition thereon is sufficient to cause substantially simultaneous fusion of the nanoparticles to thereby coalesce with each other and effectuate film growth.

  4. Improved liquid-film electron stripper

    DOE Patents [OSTI]

    Gavin, B.F.

    1984-11-01

    An improved liquid-film electron stripper particularly for high intensity heavy ion beams which produces constant regenerated, stable, free-standing liquid films having an adjustable thickness between 0.3 to 0.05 microns. The improved electron stripper is basically composed of at least one high speed, rotating disc with a very sharp, precision-like, ground edge on one side of the disc's periphery and with highly polished, flat, radial surface adjacent the sharp edge. A fine stream of liquid, such as oil, impinges at a 90/sup 0/ angle adjacent the disc's sharp outer edge. Film terminators, located at a selected distance from the disc perimeter are positioned approximately perpendicular to the film. The terminators support, shape, and stretch the film and are arranged to assist in the prevention of liquid droplet formation by directing the collected film to a reservoir below without breaking or interfering with the film. One embodiment utilizes two rotating discs and associated terminators, with the discs rotating so as to form films in opposite directions, and with the second disc being located down beam-line relative to the first disc.

  5. Organic conductive films for semiconductor electrodes

    DOE Patents [OSTI]

    Frank, A.J.

    1984-01-01

    According to the present invention, improved electrodes overcoated with conductive polymer films and preselected catalysts are provided. The electrodes typically comprise an inorganic semiconductor over-coated with a charge conductive polymer film comprising a charge conductive polymer in or on which is a catalyst or charge-relaying agent.

  6. Diamond film growth from fullerene precursors

    DOE Patents [OSTI]

    Gruen, Dieter M. (Downers Grove, IL); Liu, Shengzhong (Woodridge, IL); Krauss, Alan R. (Naperville, IL); Pan, Xianzheng (Woodridge, IL)

    1997-01-01

    A method and system for manufacturing diamond film. The method involves forming a fullerene vapor, providing a noble gas stream and combining the gas with the fullerene vapor, passing the combined fullerene vapor and noble gas carrier stream into a chamber, forming a plasma in the chamber causing fragmentation of the fullerene and deposition of a diamond film on a substrate.

  7. Preparation of a semiconductor thin film

    DOE Patents [OSTI]

    Pehnt, Martin; Schulz, Douglas L.; Curtis, Calvin J.; Ginley, David S.

    1998-01-01

    A process for the preparation of a semiconductor film. The process comprises depositing nanoparticles of a semiconductor material onto a substrate whose surface temperature during nanoparticle deposition thereon is sufficient to cause substantially simultaneous fusion of the nanoparticles to thereby coalesce with each other and effectuate film growth.

  8. Thin films of mixed metal compounds

    DOE Patents [OSTI]

    Mickelsen, Reid A.; Chen, Wen S.

    1985-01-01

    A compositionally uniform thin film of a mixed metal compound is formed by simultaneously evaporating a first metal compound and a second metal compound from independent sources. The mean free path between the vapor particles is reduced by a gas and the mixed vapors are deposited uniformly. The invention finds particular utility in forming thin film heterojunction solar cells.

  9. Organic conductive films for semiconductor electrodes

    DOE Patents [OSTI]

    Frank, Arthur J.

    1984-01-01

    According to the present invention, improved electrodes overcoated with conductive polymer films and preselected catalysts are provided. The electrodes typically comprise an inorganic semiconductor overcoated with a charge conductive polymer film comprising a charge conductive polymer in or on which is a catalyst or charge-relaying agent.

  10. Thin palladium films on silicon and titanium

    SciTech Connect (OSTI)

    Harris, L.A.

    1982-12-01

    Films of Pd from 20 to 160A thick were deposited on sputter-etched Si and on Ti films of Si and then tested electrochemically in 0.5M H/sub 2/SO/sub 4/. The behavior characteristic of Pd metal was lost with prolonged storage or with extended electrochemical cycling. The thinner films produced oxidation and reduction peaks in the voltammograms similar to the hydrogen peaks observed with Pt. Hydrogen sorption measured from voltammograms at different sweep rates and by pulse measurements indicates a definite diffusion component that begins to limit hydrogen sorption for P films thicker than about 80A. Shifts of the oxygen reduction peak indicate an increase in oxygen bonding strength as the films are made thinner.

  11. A Monte Carlo study of reflection electron energy loss spectroscopy spectrum of a carbon contaminated surface

    SciTech Connect (OSTI)

    Da, B.; Li, Z. Y.; Chang, H. C.; Ding, Z. J.; Mao, S. F.

    2014-09-28

    It has been experimentally found that the carbon surface contamination influences strongly the spectrum signals in reflection electron energy loss spectroscopy (REELS) especially at low primary electron energy. However, there is still little theoretical work dealing with the carbon contamination effect in REELS. Such a work is required to predict REELS spectrum for layered structural sample, providing an understanding of the experimental phenomena observed. In this study, we present a numerical calculation result on the spatially varying differential inelastic mean free path for a sample made of a carbon contamination layer of varied thickness on a SrTiO{sub 3} substrate. A Monte Carlo simulation model for electron interaction with a layered structural sample is built by combining this inelastic scattering cross-section with the Mott's cross-section for electron elastic scattering. The simulation results have clearly shown that the contribution of the electron energy loss from carbon surface contamination increases with decreasing primary energy due to increased individual scattering processes along trajectory parts carbon contamination layer. Comparison of the simulated spectra for different thicknesses of the carbon contamination layer and for different primary electron energies with experimental spectra clearly identifies that the carbon contamination in the measured sample was in the form of discontinuous islands other than the uniform film.

  12. Research Needs: Glass Solar Reflectance and Vinyl Siding

    SciTech Connect (OSTI)

    Hart, Robert; Curcija, Charlie; Arasteh, Dariush; Goudey, Howdy; Kohler, Christian; Selkowitz, Stephen

    2011-07-07

    The subject of glass solar reflectance and its contribution to permanent vinyl siding distortion has not been extensively studied, and some phenomena are not yet well understood. This white paper presents what is known regarding the issue and identifies where more research is needed. Three primary topics are discussed: environmental factors that control the transfer of heat to and from the siding surface; vinyl siding properties that may affect heat build-up and permanent distortion; and factors that determine the properties of reflected solar radiation from glass surfaces, including insulating window glass. Further research is needed to fully characterize the conditions associated with siding distortion, the scope of the problem, physical properties of vinyl siding, insulating window glass reflection characteristics, and possible mitigation or prevention strategies.

  13. DYNA3D Non-reflecting Boundary Conditions - Test Problems

    SciTech Connect (OSTI)

    Zywicz, E

    2006-09-28

    Two verification problems were developed to test non-reflecting boundary segments in DYNA3D (Whirley and Engelmann, 1993). The problems simulate 1-D wave propagation in a semi-infinite rod using a finite length rod and non-reflecting boundary conditions. One problem examines pure pressure wave propagation, and the other problem explores pure shear wave propagation. In both problems the non-reflecting boundary segments yield results that differ only slightly (less than 6%) during a short duration from their corresponding theoretical solutions. The errors appear to be due to the inability to generate a true step-function compressive wave in the pressure wave propagation problem and due to segment integration inaccuracies in the shear wave propagation problem. These problems serve as verification problems and as regression test problems for DYNA3D.

  14. Fiber optic moisture sensor with moisture-absorbing reflective target

    DOE Patents [OSTI]

    Kirkham, Randy R.

    1987-01-01

    A method and apparatus for sensing moisture changes by utilizing optical fiber technology. One embodiment uses a reflective target at the end of an optical fiber. The reflectance of the target varies with its moisture content and can be detected by a remote unit at the opposite end of the fiber. A second embodiment utilizes changes in light loss along the fiber length. This can be attributed to changes in reflectance of cladding material as a function of its moisture content. It can also be affected by holes or inserts interposed in the cladding material and/or fiber. Changing light levels can also be coupled from one fiber to another in an assembly of fibers as a function of varying moisture content in their overlapping lengths of cladding material.

  15. Reflective insulating blinds for windows and the like

    DOE Patents [OSTI]

    Barnes, P.R.; Shapira, H.B.

    1979-12-07

    Energy-conserving window blinds are provided. The blinds are fabricated from coupled and adjustable slats, each slat having an insulation layer and a reflective surface to face outwardly when the blinds are closed. A range of desired light and air transmission may be selected with the reflective surfaces of the slats adapted to direct sunlight upward toward the ceiling when the blinds are open. When the blinds are closed, the insulation of the slats reduces the heat loss or gain produced by the windows. If desired, the reflective surfaces of the slats may be concave. The edges of the slats are designed to seal against adjacent slats when the blinds are closed to ensure minimum air flow between slats.

  16. Reflective insulating blinds for windows and the like

    DOE Patents [OSTI]

    Barnes, Paul R.; Shapira, Hanna B.

    1981-01-01

    Energy-conserving window blinds are provided. The blinds are fabricated from coupled and adjustable slats, each slat having an insulation layer and a reflective surface to face outwardly when the blinds are closed. A range of desired light and air transmission may be selected with the reflective surfaces of the slats adapted to direct sunlight upward toward the ceiling when the blinds are open. When the blinds are closed, the insulation of the slats reduces the heat loss or gain produced by the windows. If desired, the reflective surfaces of the slats may be concave. The edges of the slats are designed to seal against adjacent slats when the blinds are closed to ensure minimum air flow between slats.

  17. Effect of window reflections on photonic Doppler velocimetry measurements

    SciTech Connect (OSTI)

    Ao, T.; Dolan, D. H.

    2011-02-15

    Photonic Doppler velocimetry (PDV) has rapidly become a standard diagnostic for measuring velocities in dynamic compression research. While free surface velocity measurements are fairly straightforward, complications occur when PDV is used to measure a dynamically loaded sample through a window. Fresnel reflections can severely affect the velocity and time resolution of PDV measurements, especially for low-velocity transients. Shock experiments of quartz compressed between two sapphire plates demonstrate how optical window reflections cause ringing in the extracted PDV velocity profile. Velocity ringing is significantly reduced by using either a wedge window or an antireflective coating.

  18. Visible Reflectivity System for High-Pressure Studies. (Journal Article) |

    Office of Scientific and Technical Information (OSTI)

    SciTech Connect SciTech Connect Search Results Journal Article: Visible Reflectivity System for High-Pressure Studies. Citation Details In-Document Search Title: Visible Reflectivity System for High-Pressure Studies. Authors: Seagle, Christopher T ; Dolan, III, Daniel H Publication Date: 2013-04-01 OSTI Identifier: 1073453 Report Number(s): SAND2013-2893J Journal ID: ISSN 0034-6748 DOE Contract Number: AC04-94AL85000 Resource Type: Journal Article Resource Relation: Journal Name: Review of

  19. Composite polymeric film and method for its use in installing a very thin polymeric film in a device

    DOE Patents [OSTI]

    Duchane, David V.; Barthell, Barry L.

    1984-01-01

    A composite polymeric film and a method for its use in forming and installing a very thin (<10 .mu.m) polymeric film are disclosed. The composite film consists of a thin film layer and a backing layer. The backing layer is soluble in a solvent in which the thin film layer is not soluble. In accordance with the method, the composite film is installed in a device in the same position in which it is sought to finally emplace the thin film. The backing layer is then selectively dissolved in the solvent to leave the insoluble thin film layer as an unbacked film. The method permits a very thin film to be successfully installed in devices where the fragility of the film would preclude handling and installation by conventional methods.

  20. Composite polymeric film and method for its use in installing a very-thin polymeric film in a device

    DOE Patents [OSTI]

    Duchane, D.V.; Barthell, B.L.

    1982-04-26

    A composite polymeric film and a method for its use in forming and installing a very thin (< 10 ..mu..m) polymeric film are disclosed. The composite film consists of a thin film layer and a backing layer. The backing layer is soluble in a solvent in which the thin film layer is not soluble. In accordance with the method, the composite film is installed in a device in the same position in which it is sought to finally emplace the thin film. The backing layer is then selectiely dissolved in the solvent to leave the insoluble thin film layer as an unbacked film. The method permits a very thin film to e successfully installed in devices where the fragility of the film would preclude handling and installation by conventional methods.

  1. Permanent laser conditioning of thin film optical materials

    DOE Patents [OSTI]

    Wolfe, C. Robert; Kozlowski, Mark R.; Campbell, John H.; Staggs, Michael; Rainer, Frank

    1995-01-01

    The invention comprises a method for producing optical thin films with a high laser damage threshold and the resulting thin films. The laser damage threshold of the thin films is permanently increased by irradiating the thin films with a fluence below an unconditioned laser damage threshold.

  2. Permanent laser conditioning of thin film optical materials

    DOE Patents [OSTI]

    Wolfe, C.R.; Kozlowski, M.R.; Campbell, J.H.; Staggs, M.; Rainer, F.

    1995-12-05

    The invention comprises a method for producing optical thin films with a high laser damage threshold and the resulting thin films. The laser damage threshold of the thin films is permanently increased by irradiating the thin films with a fluence below an unconditioned laser damage threshold. 9 figs.

  3. Broad Band Intra-Cavity Total Reflection Chemical Sensor

    DOE Patents [OSTI]

    Pipino, Andrew C. R.

    1998-11-10

    A broadband, ultrahigh-sensitivity chemical sensor is provided that allows etection through utilization of a small, extremely low-loss, monolithic optical cavity. The cavity is fabricated from highly transparent optical material in the shape of a regular polygon with one or more convex facets to form a stable resonator for ray trajectories sustained by total internal reflection. Optical radiation enters and exits the monolithic cavity by photon tunneling in which two totally reflecting surfaces are brought into close proximity. In the presence of absorbing material, the loss per pass is increased since the evanescent waves that exist exterior to the cavity at points where the circulating pulse is totally reflected, are absorbed. The decay rate of an injected pulse is determined by coupling out an infinitesimal fraction of the pulse to produce an intensity-versus-time decay curve. Since the change in the decay rate resulting from absorption is inversely proportional to the magnitude of absorption, a quantitative sensor of concentration or absorption cross-section with 1 part-per-million/pass or better sensitivity is obtained. The broadband nature of total internal reflection permits a single device to be used over a broad wavelength range. The absorption spectrum of the surrounding medium can thereby be obtained as a measurement of inverse decay time as a function of wavelength.

  4. Ion-acoustic shocks with self-regulated ion reflection and acceleratio...

    Office of Scientific and Technical Information (OSTI)

    Ion-acoustic shocks with self-regulated ion reflection and acceleration Citation Details ... Title: Ion-acoustic shocks with self-regulated ion reflection and acceleration Authors: ...

  5. Electron scattering mechanisms in Cu-Mn films for interconnect applications

    SciTech Connect (OSTI)

    Misjk, F.; Nagy, K. H.; Radnczi, G.; Lobotka, P.

    2014-08-28

    Electrical properties and corresponding structural features of Cu-Mn alloy films with potential application as barrier and interconnect layers were studied. Cu-Mn films were deposited by DC magnetron sputtering at room temperature on SiO{sub 2} substrates. Electrical resistivity measurements were made as a function of film composition and temperature. The specific resistivity varies linearly with the Mn content showing a maximum of 205???cm at 80 at. % Mn. The temperature coefficient of resistance (TCR) of all alloy films is low, showing non-metallic conductivity for most compositions. Also a minimum TCR has been observed in the 4080 at. % Mn range which was attributed to a magnetic transformation around 200300?K. Electrical resistivity measurements are correlated with the film structure revealed by transmission electron microscopy to clarify the phase regions throughout the composition range. In the 2040 at. % and 7080 at. % Mn ranges, two-phase structures were identified, where Cu- or Mn-rich solid solution grains were surrounded by a thin amorphous covering layer. Based on the revealed phase regions and morphologies electron scattering mechanisms in the system were evaluated by combining the Matthiessen's rule and the Mayadas-Schatzkes theory. Grain boundary reflectivity coefficients (r?=?0.60.8) were calculated from fitting the model to the measurements. The proposed model indicates that, in a binary system, the special arrangement of the two phases results in new scattering mechanisms. The results are of value in optimizing the various parameters needed to produce a suitable barrier layer.

  6. Nanomechanics of hard films on compliant substrates.

    SciTech Connect (OSTI)

    Reedy, Earl David, Jr.; Emerson, John Allen; Bahr, David F.; Moody, Neville Reid; Zhou, Xiao Wang; Hales, Lucas; Adams, David Price; Yeager,John; Nyugen, Thao D.; Corona, Edmundo; Kennedy, Marian S.; Cordill, Megan J.

    2009-09-01

    Development of flexible thin film systems for biomedical, homeland security and environmental sensing applications has increased dramatically in recent years [1,2,3,4]. These systems typically combine traditional semiconductor technology with new flexible substrates, allowing for both the high electron mobility of semiconductors and the flexibility of polymers. The devices have the ability to be easily integrated into components and show promise for advanced design concepts, ranging from innovative microelectronics to MEMS and NEMS devices. These devices often contain layers of thin polymer, ceramic and metallic films where differing properties can lead to large residual stresses [5]. As long as the films remain substrate-bonded, they may deform far beyond their freestanding counterpart. Once debonded, substrate constraint disappears leading to film failure where compressive stresses can lead to wrinkling, delamination, and buckling [6,7,8] while tensile stresses can lead to film fracture and decohesion [9,10,11]. In all cases, performance depends on film adhesion. Experimentally it is difficult to measure adhesion. It is often studied using tape [12], pull off [13,14,15], and peel tests [16,17]. More recent techniques for measuring adhesion include scratch testing [18,19,20,21], four point bending [22,23,24], indentation [25,26,27], spontaneous blisters [28,29] and stressed overlayers [7,26,30,31,32,33]. Nevertheless, sample design and test techniques must be tailored for each system. There is a large body of elastic thin film fracture and elastic contact mechanics solutions for elastic films on rigid substrates in the published literature [5,7,34,35,36]. More recent work has extended these solutions to films on compliant substrates and show that increasing compliance markedly changes fracture energies compared with rigid elastic solution results [37,38]. However, the introduction of inelastic substrate response significantly complicates the problem [10,39,40]. As a result, our understanding of the critical relationship between adhesion, properties, and fracture for hard films on compliant substrates is limited. To address this issue, we integrated nanomechanical testing and mechanics-based modeling in a program to define the critical relationship between deformation and fracture of nanoscale films on compliant substrates. The approach involved designing model film systems and employing nano-scale experimental characterization techniques to isolate effects of compliance, viscoelasticity, and plasticity on deformation and fracture of thin hard films on substrates that spanned more than two orders of compliance magnitude exhibit different interface structures, have different adhesion strengths, and function differently under stress. The results of this work are described in six chapters. Chapter 1 provides the motivation for this work. Chapter 2 presents experimental results covering film system design, sample preparation, indentation response, and fracture including discussion on the effects of substrate compliance on fracture energies and buckle formation from existing models. Chapter 3 describes the use of analytical and finite element simulations to define the role of substrate compliance and film geometry on the indentation response of thin hard films on compliant substrates. Chapter 4 describes the development and application of cohesive zone model based finite element simulations to determine how substrate compliance affects debond growth. Chapter 5 describes the use of molecular dynamics simulations to define the effects of substrate compliance on interfacial fracture of thin hard tungsten films on silicon substrates. Chapter 6 describes the Workshops sponsored through this program to advance understanding of material and system behavior.

  7. Implementation of solar-reflective surfaces: Materials and utility programs

    SciTech Connect (OSTI)

    Bretz, S.; Akbari, H.; Rosenfeld, A.; Taha, H.

    1992-06-01

    This report focuses on implementation issues for using solar-reflective surfaces to cool urban heat islands, with specific examples for Sacramento, California. Advantages of solar-reflective surfaces for reducing energy use are: (1) they are cost-effective if albedo is increased during routine maintenance; (2) the energy savings coincide with peak demand for power; (3) there are positive effects on environmental quality; and (4) the white materials have a long service life. Important considerations when choosing materials for mitigating heat islands are identified as albedo, emissivity, durability, cost, pollution and appearance. There is a potential for increasing urban albedo in Sacramento by an additional 18%. Of residential roofs, we estimate that asphalt shingle and modified bitumen cover the largest area, and that built-up roofing and modified bitumen cover the largest area of commercial buildings. For all of these roof types, albedo may be increased at the time of re-roofing without any additional cost. When a roof is repaired, a solar-reflective roof coating may be applied to significantly increase albedo and extend the life of the root Although a coating may be cost-effective if applied to a new roof following installation or to an older roof following repair, it is not cost-effective if the coating is applied only to save energy. Solar-reflective pavement may be cost-effective if the albedo change is included in the routine resurfacing schedule. Cost-effective options for producing light-colored pavement may include: (1) asphalt concrete, if white aggregate is locally available; (2) concrete overlays; and (3) newly developed white binders and aggregate. Another option may be hot-rolled asphalt, with white chippings. Utilities could promote solar-reflective surfaces through advertisement, educational programs and cost-sharing of road resurfacing.

  8. Thin film growth of boron nitride on {alpha}-Al{sub 2}O{sub 3} (0 0 1) substrates by reactive sputtering

    SciTech Connect (OSTI)

    Anzai, Atsushi; Nishiyama, Fumitaka; Yamanaka, Shoji; Inumaru, Kei

    2011-12-15

    Highlights: Black-Right-Pointing-Pointer A BN film grown on {alpha}-Al{sub 2}O{sub 3} (0 0 1) had a structure in which h-BN sheet stacking continued through almost the whole film thickness. Black-Right-Pointing-Pointer The structure was characterized by X-ray diffraction, ATR-IR, and XPS. Black-Right-Pointing-Pointer Tauc plots suggested the film had direct band gap and the optical band gap was close to that of bulk h-BN. -- Abstract: Boron nitride thin films were grown on {alpha}-Al{sub 2}O{sub 3} (0 0 1) substrates by reactive magnetron sputtering. Infrared attenuated total reflection (ATR) spectra of the films gave an intense signal associated with in-plane B-N stretching TO mode of short range ordered structure of BN hexagonal sheets. X-ray diffraction for the film prepared at a low working pressure (ca. 1 Multiplication-Sign 10{sup -3} Torr) gave a diffraction peak at slightly lower angle than that corresponding to crystal plane h-BN (0 0 2). It is notable that crystal thickness calculated from X-ray peak linewidth (45 nm) was close to film thickness (53 nm), revealing well developed sheet stacking along the direction perpendicular to the substrate surface. When the substrates of MgO (0 0 1) and Si (0 0 1) were used, the short-range ordered structure of h-BN sheet was formed but the films gave no X-ray diffraction. The film showed optical band gap of 5.9 eV, being close to that for bulk crystalline h-BN.

  9. Polycrystalline Thin-Film Multijunction Solar Cells

    SciTech Connect (OSTI)

    Noufi, R.; Wu, X.; Abu-Shama, J.; Ramanathan, K; Dhere, R.; Zhou, J.; Coutts, T.; Contreras, M.; Gessert, T.; Ward, J. S.

    2005-11-01

    We present a digest of our research on the thin-film material components that comprise the top and bottom cells of three different material systems and the tandem devices constructed from them.

  10. Physicochemically functional ultrathin films by interfacial polymerization

    DOE Patents [OSTI]

    Lonsdale, Harold K.; Babcock, Walter C.; Friensen, Dwayne T.; Smith, Kelly L.; Johnson, Bruce M.; Wamser, Carl C.

    1990-01-01

    Interfacially-polymerized ultrathin films containing physicochemically functional groups are disclosed, both with and without supports. Various applications are disclsoed, including membrane electrodes, selective membranes and sorbents, biocompatible materials, targeted drug delivery, and narrow band optical absorbers.

  11. Nanoporous films: From conventional to the conformal

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Allendorf, Mark D.; Stavila, Vitalie

    2015-12-14

    Here, thin and continuous films of porous metal-organic frameworks can now be conformally deposited on various substrates using a vapor-phase synthesis approach that departs from conventional solution-based routes.

  12. Method for making thin polypropylene film

    DOE Patents [OSTI]

    Behymer, R.D.; Scholten, J.A.

    1985-11-21

    An economical method is provided for making uniform thickness polypropylene film as thin as 100 Angstroms. A solution of polypropylene dissolved in xylene is formed by mixing granular polypropylene and xylene together in a flask at an elevated temperature. A substrate, such as a glass plate or microscope slide is immersed in the solution. When the glass plate is withdrawn from the solution at a uniform rate, a thin polypropylene film forms on a flat surface area of the glass plate as the result of xylene evaporation. The actual thickness of the polypropylene film is functional of the polypropylene in xylene solution concentration, and the particular withdrawal rate of the glass plate from the solution. After formation, the thin polypropylene film is floated from the glass plate onto the surface of water, from which it is picked up with a wire hoop.

  13. Ultrashort pulse laser deposition of thin films

    DOE Patents [OSTI]

    Perry, Michael D.; Banks, Paul S.; Stuart, Brent C.

    2002-01-01

    Short pulse PLD is a viable technique of producing high quality films with properties very close to that of crystalline diamond. The plasma generated using femtosecond lasers is composed of single atom ions with no clusters producing films with high Sp.sup.3 /Sp.sup.2 ratios. Using a high average power femtosecond laser system, the present invention dramatically increases deposition rates to up to 25 .mu.m/hr (which exceeds many CVD processes) while growing particulate-free films. In the present invention, deposition rates is a function of laser wavelength, laser fluence, laser spot size, and target/substrate separation. The relevant laser parameters are shown to ensure particulate-free growth, and characterizations of the films grown are made using several diagnostic techniques including electron energy loss spectroscopy (EELS) and Raman spectroscopy.

  14. Tungsten-doped thin film materials

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Chang, Hauyee; Gao, Chen; Takeuchi, Ichiro; Schultz, Peter G.

    2003-12-09

    A dielectric thin film material for high frequency use, including use as a capacitor, and having a low dielectric loss factor is provided, the film comprising a composition of tungsten-doped barium strontium titanate of the general formula (Ba.sub.x Sr.sub.1-x)TiO.sub.3, where X is between about 0.5 and about 1.0. Also provided is a method for making a dielectric thin film of the general formula (Ba.sub.x Sr.sub.1-x)TiO.sub.3 and doped with W, where X is between about 0.5 and about 1.0, a substrate is provided, TiO.sub.2, the W dopant, Ba, and optionally Sr are deposited on the substrate, and the substrate containing TiO.sub.2, the W dopant, Ba, and optionally Sr is heated to form a low loss dielectric thin film.

  15. Nanoporous films: Beyond conventional to the conformal

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Allendorf, Mark D.; Stavila, Vitalie

    2015-12-01

    Here, thin and continuous films of porous metal-organic frameworks can now be conformally deposited on various substrates using a vapor-phase synthesis approach that departs from conventional solution-based routes.

  16. Thin film production method and apparatus

    DOE Patents [OSTI]

    Loutfy, Raouf O.; Moravsky, Alexander P.; Hassen, Charles N.

    2010-08-10

    A method for forming a thin film material which comprises depositing solid particles from a flowing suspension or aerosol onto a filter and next adhering the solid particles to a second substrate using an adhesive.

  17. Physicochemically functional ultrathin films by interfacial polymerization

    DOE Patents [OSTI]

    Lonsdale, H.K.; Babcock, W.C.; Friensen, D.T.; Smith, K.L.; Johnson, B.M.; Wamser, C.C.

    1990-08-14

    Interfacially-polymerized ultrathin films containing physicochemically functional groups are disclosed, both with and without supports. Various applications are disclosed, including membrane electrodes, selective membranes and sorbents, biocompatible materials, targeted drug delivery, and narrow band optical absorbers. 3 figs.

  18. Diamond film growth argon-carbon plasmas

    DOE Patents [OSTI]

    Gruen, D.M.; Krauss, A.R.; Liu, S.Z.; Pan, X.Z.; Zuiker, C.D.

    1998-12-15

    A method and system are disclosed for manufacturing diamond film. The method involves forming a carbonaceous vapor, providing a gas stream of argon, hydrogen and hydrocarbon and combining the gas with the carbonaceous vapor, passing the combined carbonaceous vapor and gas carrier stream into a chamber, forming a plasma in the chamber causing fragmentation of the carbonaceous and deposition of a diamond film on a substrate. 29 figs.

  19. Gamma irradiation effects in W films

    SciTech Connect (OSTI)

    Claro, Luiz H.; Santos, Ingrid A.; Silva, Cassia F.

    2013-05-06

    Using the van Der Pauw methodology, the surface resistivity of irradiated tungsten films deposited on Silicon substrate was measured. The films were exposed to {gamma} radiation using a isotopic {sup 60}Co source in three irradiation stages attaining 40.35 kGy in total dose. The obtained results for superficial resistivity display a time annealing features and their values are proportional to the total dose.

  20. Superconducting thin films on potassium tantalate substrates

    DOE Patents [OSTI]

    Feenstra, Roeland; Boatner, Lynn A.

    1992-01-01

    A superconductive system for the lossless transmission of electrical current comprising a thin film of superconducting material Y.sub.1 Ba.sub.2 Cu.sub.3 O.sub.7-x epitaxially deposited upon a KTaO.sub.3 substrate. The KTaO.sub.3 is an improved substrate over those of the prior art since the it exhibits small lattice constant mismatch and does not chemically react with the superconducting film.

  1. Diamond film growth from fullerene precursors

    DOE Patents [OSTI]

    Gruen, D.M.; Liu, S.; Krauss, A.R.; Pan, X.

    1997-04-15

    A method and system are disclosed for manufacturing diamond film. The method involves forming a fullerene vapor, providing a noble gas stream and combining the gas with the fullerene vapor, passing the combined fullerene vapor and noble gas carrier stream into a chamber, forming a plasma in the chamber causing fragmentation of the fullerene and deposition of a diamond film on a substrate. 10 figs.

  2. Thick crystalline films on foreign substrates

    DOE Patents [OSTI]

    Smith, Henry I.; Atwater, Harry A.; Geis, Michael W.

    1986-01-01

    To achieve a uniform texture, large crystalline grains or, in some cases, a single crystalline orientation in a thick (>1 .mu.m) film on a foreign substrate, the film is formed so as to be thin (<1 .mu.m) in a certain section. Zone-melting recrystallization is initiated in the thin section and then extended into the thick section. The method may employ planar constriction patterns of orientation filter patterns.

  3. Thick crystalline films on foreign substrates

    DOE Patents [OSTI]

    Smith, H.I.; Atwater, H.A.; Geis, M.W.

    1986-03-18

    To achieve a uniform texture, large crystalline grains or, in some cases, a single crystalline orientation in a thick (>1 [mu]m) film on a foreign substrate, the film is formed so as to be thin (<1 [mu]m) in a certain section. Zone-melting recrystallization is initiated in the thin section and then extended into the thick section. The method may employ planar constriction patterns of orientation filter patterns. 2 figs.

  4. Thin film absorber for a solar collector

    DOE Patents [OSTI]

    Wilhelm, William G.

    1985-01-01

    This invention pertains to energy absorbers for solar collectors, and more particularly to high performance thin film absorbers. The solar collectors comprising the absorber of this invention overcome several problems seen in current systems, such as excessive hardware, high cost and unreliability. In the preferred form, the apparatus features a substantially rigid planar frame with a thin film window bonded to one planar side of the frame. An absorber in accordance with the present invention is comprised of two thin film layers that are sealed perimetrically. In a preferred embodiment, thin film layers are formed from a metal/plastic laminate. The layers define a fluid-tight planar envelope of large surface area to volume through which a heat transfer fluid flows. The absorber is bonded to the other planar side of the frame. The thin film construction of the absorber assures substantially full envelope wetting and thus good efficiency. The window and absorber films stress the frame adding to the overall strength of the collector.

  5. Method and apparatus for inspecting reflection masks for defects

    DOE Patents [OSTI]

    Bokor, Jeffrey; Lin, Yun

    2003-04-29

    An at-wavelength system for extreme ultraviolet lithography mask blank defect detection is provided. When a focused beam of wavelength 13 nm is incident on a defective region of a mask blank, three possible phenomena can occur. The defect will induce an intensity reduction in the specularly reflected beam, scatter incoming photons into an off-specular direction, and change the amplitude and phase of the electric field at the surface which can be monitored through the change in the photoemission current. The magnitude of these changes will depend on the incident beam size, and the nature, extent and size of the defect. Inspection of the mask blank is performed by scanning the mask blank with 13 nm light focused to a spot a few .mu.m in diameter, while measuring the reflected beam intensity (bright field detection), the scattered beam intensity (dark-field detection) and/or the change in the photoemission current.

  6. Improved Method to Measure Glare and Reflected Solar Irradiance - Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Innovation Portal Solar Thermal Solar Thermal Industrial Technologies Industrial Technologies Energy Analysis Energy Analysis Early Stage R&D Early Stage R&D Find More Like This Return to Search Improved Method to Measure Glare and Reflected Solar Irradiance Sandia National Laboratories Contact SNL About This Technology Publications: PDF Document Publication Market Sheet (767 KB) Solar glare from aerial view Solar glare from aerial view Typical solar glare Typical solar glare

  7. Time Correlations in Backscattering Radar Reflectivity Measurements from Cirrus Clouds

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Time Correlations in Backscattering Radar Reflectivity Measurements from Cirrus Clouds K. Ivanova, H. N. Shirer, and E. E. Clothiaux Pennsylvania State University University Park, Pennsylvania T. P. Ackerman Pacific Northwest National Laboratory Richland, Washington Introduction The state variables of the atmosphere exhibit correlations at various spatial and temporal scales. These correlations are crucial for understanding short- and long-term trends in climate. Cirrus clouds are important

  8. Multiple-channel, total-reflection optic with controllable divergence

    DOE Patents [OSTI]

    Gibson, David M.; Downing, Robert G.

    1997-01-01

    An apparatus and method for providing focused x-ray, gamma-ray, charged particle and neutral particle, including neutron, radiation beams with a controllable amount of divergence are disclosed. The apparatus features a novel use of a radiation blocking structure, which, when combined with multiple-channel total reflection optics, increases the versatility of the optics by providing user-controlled output-beam divergence.

  9. Multiple-channel, total-reflection optic with controllable divergence

    DOE Patents [OSTI]

    Gibson, D.M.; Downing, R.G.

    1997-02-18

    An apparatus and method for providing focused x-ray, gamma-ray, charged particle and neutral particle, including neutron, radiation beams with a controllable amount of divergence are disclosed. The apparatus features a novel use of a radiation blocking structure, which, when combined with multiple-channel total reflection optics, increases the versatility of the optics by providing user-controlled output-beam divergence. 11 figs.

  10. Real time intelligent process control system for thin film solar cell manufacturing

    SciTech Connect (OSTI)

    George Atanasoff

    2010-10-29

    This project addresses the problem of lower solar conversion efficiency and waste in the typical solar cell manufacturing process. The work from the proposed development will lead toward developing a system which should be able to increase solar panel conversion efficiency by an additional 12-15% resulting in lower cost panels, increased solar technology adoption, reduced carbon emissions and reduced dependency on foreign oil. All solar cell manufacturing processes today suffer from manufacturing inefficiencies that currently lead to lower product quality and lower conversion efficiency, increased product cost and greater material and energy consumption. This results in slower solar energy adoption and extends the time solar cells will reach grid parity with traditional energy sources. The thin film solar panel manufacturers struggle on a daily basis with the problem of thin film thickness non-uniformity and other parameters variances over the deposited substrates, which significantly degrade their manufacturing yield and quality. Optical monitoring of the thin films during the process of the film deposition is widely perceived as a necessary step towards resolving the non-uniformity and non-homogeneity problem. In order to enable the development of an optical control system for solar cell manufacturing, a new type of low cost optical sensor is needed, able to acquire local information about the panel under deposition and measure its local characteristics, including the light scattering in very close proximity to the surface of the film. This information cannot be obtained by monitoring from outside the deposition chamber (as traditional monitoring systems do) due to the significant signal attenuation and loss of its scattering component before the reflected beam reaches the detector. In addition, it would be too costly to install traditional external in-situ monitoring systems to perform any real-time monitoring over large solar panels, since it would require significant equipment refurbishing needed for installation of multiple separate ellipsometric systems, and development of customized software to control all of them simultaneously. The proposed optical monitoring system comprises AccuStratas fiber optics sensors installed inside the thin film deposition equipment, a hardware module of different components (beyond the scope of this project) and our software program with iterative predicting capability able to control material bandgap and surface roughness as films are deposited. Our miniature fiber optics monitoring sensors are installed inside the vacuum chamber compartments in very close proximity where the independent layers are deposited (an option patented by us in 2003). The optical monitoring system measures two of the most important parameters of the photovoltaic thin films during deposition on a moving solar panel - material bandgap and surface roughness. In this program each sensor array consists of two fiber optics sensors monitoring two independent areas of the panel under deposition. Based on the monitored parameters and their change in time and from position to position on the panel, the system is able to provide to the equipment operator immediate information about the thin films as they are deposited. This DoE Supply Chain program is considered the first step towards the development of intelligent optical control system capable of dynamically adjusting the manufacturing process on-the-fly in order to achieve better performance. The proposed system will improve the thin film solar cell manufacturing by improving the quality of the individual solar cells and will allow for the manufacturing of more consistent and uniform products resulting in higher solar conversion efficiency and manufacturing yield. It will have a significant impact on the multibillion-dollar thin film solar market. We estimate that the financial impact of these improvements if adopted by only 10% of the industry ($7.7 Billion) would result in about $1.5 Billion in savings by 2015 (at the assumed 20% improvement). This can b

  11. Reflection seismic mapping of an abandoned coal mine, Belleville, Illinois

    SciTech Connect (OSTI)

    Anderson, N.; Hinds, R.; Roark, M.

    1997-10-01

    Old mine location maps (1958 vintage) indicate that the northwestern part of an undeveloped property near the town of Belleville, St. Clair County, Illinois, is situated above an abandoned and now water-filled, room-and-pillar type coal mine. The central and southeast parts of the Belleville property are shown as overlying intact (non-mined) coal. The coal unit mined at the Belleville site, the Herrin No. 6 is Pennsylvanian in age and about 2.5 m thick at a depth of around 40 m. The current owners of the Belleville property want to construct a large building on the central and southeast parts of the site, but have been concerned about the accuracy of the old mine location maps because of recent mine-related surface subsidence in areas designated on the maps as not mined. To ensure that the proposed new development is located on structurally stable ground, a grid of ten high-resolution reflection seismic lines was acquired on-site. On these reflection seismic data, mined-out areas can be visually identified and differentiated from non-mined areas. The interpretation of the reflection seismic data was constrained and validated by 15 test boreholes. These seismic and borehole data confirm that the central and southeast parts of the property have not been mined extensively. Development of the Belleville site has proceeded with confidence.

  12. Inversion of seismic reflection traveltimes using a nonlinear optimization scheme

    SciTech Connect (OSTI)

    Pullammanappallil, S.K.; Louie, J.N. (Univ. of Nevada, Reno, NV (United States). Mackay School of Mines)

    1993-11-01

    The authors present the use of a nonlinear optimization scheme called generalized simulated annealing to invert seismic reflection times for velocities, reflector depths, and lengths. A finite-difference solution of the eikonal equation computes reflection traveltimes through the velocity model and avoids ray tracing. They test the optimization scheme on synthetic models and compare it with results from a linearized inversion. The synthetic tests illustrate that, unlike linear inversion schemes, the results obtained by the optimization scheme are independent of the initial model. The annealing method has the ability to produce a suite of models that satisfy the data equally well. They make use of this property to determine the uncertainties associated with the model parameters obtained. Synthetic examples demonstrate that allowing the reflector length to vary, along with its position, helps the optimization process obtain a better solution. The authors put this to use in imaging the Garlock fault, whose geometry at depth is poorly known. They use reflection times picked from shot gathers recorded along COCORP Mojave Line 5 to invert for the Garlock fault and velocities within the Cantil Basin below Fremont Valley, California. The velocities within the basin obtained by their optimization scheme are consistent with earlier studies, though their results suggest that the basin might extend 1--2 km further south. The reconstructed reflector seems to suggest shallowing of the dip of the Garlock fault at depth.

  13. Ambient pressure process for preparing aerogel thin films reliquified sols useful in preparing aerogel thin films

    DOE Patents [OSTI]

    Brinker, Charles Jeffrey; Prakash, Sai Sivasankaran

    1999-01-01

    A method for preparing aerogel thin films by an ambient-pressure, continuous process. The method of this invention obviates the use of an autoclave and is amenable to the formation of thin films by operations such as dip coating. The method is less energy intensive and less dangerous than conventional supercritical aerogel processing techniques.

  14. Visible light carrier generation in co-doped epitaxial titanate films

    SciTech Connect (OSTI)

    Comes, Ryan B.; Smolin, Sergey Y.; Kaspar, Tiffany C.; Gao, Ran; Apgar, Brent A.; Martin, Lane W.; Bowden, Mark E.; Baxter, Jason; Chambers, Scott A.

    2015-03-02

    Perovskite titanates such as SrTiO3 (STO) exhibit a wide range of important functional properties, including high electron mobility, ferroelectricitywhich may be valuable in photovoltaic applicationsand excellent photocatalytic performance. The wide optical band gap of titanates limits their use in these applications, however, making them ill-suited for integration into solar energy harvesting technologies. Our recent work has shown that by doping STO with equal concentrations of La and Cr we can enhance visible light absorption in epitaxial thin films while avoiding any compensating defects. In this work, we explore the optical properties of photoexcited carriers in these films. Using spectroscopic ellipsometry, we show that the Cr3+ dopants, which produce electronic states immediately above the top of the O 2p valence band in STO reduce the direct band gap of the material from 3.75 eV to between 2.4 and 2.7 eV depending on doping levels. Transient reflectance measurements confirm that optically generated carriers have a recombination lifetime comparable to that of STO and are in agreement with the observations from ellipsometry. Finally, through photoelectrochemical yield measurements, we show that these co-doped films exhibit enhanced visible light photocatalysis when compared to pure STO.

  15. Visible light carrier generation in co-doped epitaxial titanate films

    SciTech Connect (OSTI)

    Comes, Ryan B. Kaspar, Tiffany C.; Chambers, Scott A.; Smolin, Sergey Y.; Baxter, Jason B.; Gao, Ran; Apgar, Brent A.; Martin, Lane W.; Bowden, Mark E.

    2015-03-02

    Perovskite titanates such as SrTiO{sub 3} (STO) exhibit a wide range of important functional properties, including ferroelectricity and excellent photocatalytic performance. The wide optical band gap of titanates limits their use in these applications; however, making them ill-suited for integration into solar energy harvesting technologies. Our recent work has shown that by doping STO with equal concentrations of La and Cr, we can enhance visible light absorption in epitaxial thin films while avoiding any compensating defects. In this work, we explore the optical properties of photoexcited carriers in these films. Using spectroscopic ellipsometry, we show that the Cr{sup 3+} dopants, which produce electronic states immediately above the top of the O 2p valence band in STO reduce the direct band gap of the material from 3.75?eV to 2.42.7?eV depending on doping levels. Transient reflectance spectroscopy measurements are in agreement with the observations from ellipsometry and confirm that optically generated carriers are present for longer than 2?ns. Finally, through photoelectrochemical methylene blue degradation measurements, we show that these co-doped films exhibit enhanced visible light photocatalysis when compared to pure STO.

  16. Synthesis, Structure, and Spectroscopy of Epitaxial EuFeO3 Thin Films

    SciTech Connect (OSTI)

    Choquette, Amber K.; Colby, Robert J.; Moon, E. J.; Schleputz, C. M.; Scafetta, Mark D.; Keavney, David J.; May, Steven J.

    2015-03-04

    Rare earth iron perovskites RFeO3, where R is a rare earth cation, exhibit an array of magnetic, catalytic, optical and electrochemical properties. Here we study EuFeO3 films synthesized by molecular beam epitaxy in order to better understand the optical properties of ferrites. A combination of x-ray diffraction, x-ray reflectivity, Rutherford backscattering spectroscopy, and scanning transmission electron microscopy were used to characterize the film structure and cation composition. X-ray absorption spectroscopy confirms the nominal 3+ valence states of Eu and Fe. The optical properties of EuFeO3 were investigated using variable angle spectroscopic ellipsometry between the phonon energies of 1.25 to 5 eV. We find that EuFeO3 is a semiconductor with an onset of optical absorption near 2.5 eV. The absorption spectrum of EuFeO3 is blue-shifted with respect to LaFeO3 films, a result that is attributed to the structural differences of the two materials.

  17. Laser-induced short time scale thermal chemistry of perfluoropolyether lubricant films

    SciTech Connect (OSTI)

    Heller, J.; Mate, C.J.; Poon, C.C.; Tam, A.C.

    1999-11-09

    The authors investigate the effect of heating a perfluoropolyether lubricant film in a localized area for relatively short time periods using laser irradiation versus conventional oven heating. These experiments help provide understanding on how flash temperatures generated at frictional contacts affect the thermal chemistry of lubricant films. In these experiments, a CO{sub 2} laser heats a 50 {micro}m wide area of a silicon wafer for time periods ranging from 0.1 to 60 s. The surface temperature within the heated area (up to 280 C in these experiments) is monitored with a second laser by measuring the change in reflectivity near the center of the heated area. A major difference observed for laser heating compared to oven heating is that the effective evaporation rate is orders of magnitude higher for laser heating. If the lubricant film is heated for sufficiently long enough time at high temperatures, the authors are able to observe thermal bonding of the lubricant via its alcohol end groups to the silicon oxide surface, followed by thermal decomposition of the lubricant molecules. After laser heating, the authors are able to observe the diffusion of lubricant back into the localized heated area using a combination of optical microscopy and imaging ellipsometry.

  18. Alternative Fuels Data Center: Clean Cities Reflects on 20 Years of

    Alternative Fuels and Advanced Vehicles Data Center [Office of Energy Efficiency and Renewable Energy (EERE)]

    Alternative Fuels Clean Cities Reflects on 20 Years of Alternative Fuels to someone by E-mail Share Alternative Fuels Data Center: Clean Cities Reflects on 20 Years of Alternative Fuels on Facebook Tweet about Alternative Fuels Data Center: Clean Cities Reflects on 20 Years of Alternative Fuels on Twitter Bookmark Alternative Fuels Data Center: Clean Cities Reflects on 20 Years of Alternative Fuels on Google Bookmark Alternative Fuels Data Center: Clean Cities Reflects on 20 Years of

  19. Localization of excitons by molecular layer formation in a polymer film

    SciTech Connect (OSTI)

    Chattopadhyay, S.; Datta, A.

    2005-10-15

    Spin coated films of atactic polystyrene of two different molecular weights have been studied with uv spectroscopy and x-ray reflectivity, the film thickness (d) varying from {approx}2R{sub g} to {approx}12R{sub g} where R{sub g} is the unperturbed radius of gyration of the polymer. uv extinction due to the pure electronic singlet {sup 1}A{sub 1g}{yields}{sup 1}E{sub 1u} is seen to increase with d{sup -1} for 4R{sub g}{<=}d{<=}12R{sub g} (region 1). This suggests excitonic interaction along d. The variation of total exciton energy (E) of the A{sub 1g}{yields}E{sub 1u} singlet with d in region 1 can be well explained by formation of linear J-aggregates of polystyrene molecules, in a lattice with spacing 'a' (in A) R{sub g}films show the presence of 'spheres' distributed randomly on film surfaces with in-plane dimensions matching a. From the variation of E with d{sup -2} the effective mass (m{sub eff}) of the exciton is also determined. For R{sub g}films extracted from x-ray reflectivity studies, indicate formation of layers with period 'b' (in A), R{sub g}film in region 1. On raising the temperature of a typical film to 60 deg. C, the layering was seen to almost vanish, as obtained from both the EDP and the Patterson function of the reflectivity profile. The close correspondence between 'a' and 'b' indicates that the molecules forming the J-aggregates form the layers, too. The average difference in {rho} between successive extrema in the EDPs in region 2, denoted by {delta}, can be used as the order parameter for the layering transition. For PS-5, {delta}>0 at d{approx_equal}4R{sub g}, where the exciton is still delocalized. Layering reduces the Hamaker constant (A{sub H}), deciding the cohesive force, between the layers and this reduction, {delta}A{sub H}, is found to be less than A{sub e} at d{>=}4R{sub g}, where iA{sub e}/({Dirac_h}/2{pi}) is the amplitude for exciton transfer between neighboring molecules in the excitonic lattice of region 1. On the other hand, {delta}A{sub H} in region 2 starts from a value larger than A{sub e}. This indicates that {delta}A{sub H} acts as a barrier between the layer, which localizes the exciton within the layers.

  20. Method of improving field emission characteristics of diamond thin films

    DOE Patents [OSTI]

    Krauss, A.R.; Gruen, D.M.

    1999-05-11

    A method of preparing diamond thin films with improved field emission properties is disclosed. The method includes preparing a diamond thin film on a substrate, such as Mo, W, Si and Ni. An atmosphere of hydrogen (molecular or atomic) can be provided above the already deposited film to form absorbed hydrogen to reduce the work function and enhance field emission properties of the diamond film. In addition, hydrogen can be absorbed on intergranular surfaces to enhance electrical conductivity of the diamond film. The treated diamond film can be part of a microtip array in a flat panel display. 3 figs.

  1. Replacing 16 mm film cameras with high definition digital cameras

    SciTech Connect (OSTI)

    Balch, K.S.

    1995-12-31

    For many years 16 mm film cameras have been used in severe environments. These film cameras are used on Hy-G automotive sleds, airborne gun cameras, range tracking and other hazardous environments. The companies and government agencies using these cameras are in need of replacing them with a more cost effective solution. Film-based cameras still produce the best resolving capability, however, film development time, chemical disposal, recurring media cost, and faster digital analysis are factors influencing the desire for a 16 mm film camera replacement. This paper will describe a new camera from Kodak that has been designed to replace 16 mm high speed film cameras.

  2. Method of improving field emission characteristics of diamond thin films

    DOE Patents [OSTI]

    Krauss, Alan R. (Naperville, IL); Gruen, Dieter M. (Downer Grove, IL)

    1999-01-01

    A method of preparing diamond thin films with improved field emission properties. The method includes preparing a diamond thin film on a substrate, such as Mo, W, Si and Ni. An atmosphere of hydrogen (molecular or atomic) can be provided above the already deposited film to form absorbed hydrogen to reduce the work function and enhance field emission properties of the diamond film. In addition, hydrogen can be absorbed on intergranular surfaces to enhance electrical conductivity of the diamond film. The treated diamond film can be part of a microtip array in a flat panel display.

  3. Method to adjust multilayer film stress induced deformation of optics

    DOE Patents [OSTI]

    Mirkarimi, Paul B.; Montcalm, Claude

    2000-01-01

    A buffer-layer located between a substrate and a multilayer for counteracting stress in the multilayer. Depositing a buffer-layer having a stress of sufficient magnitude and opposite in sign reduces or cancels out deformation in the substrate due to the stress in the multilayer. By providing a buffer-layer between the substrate and the multilayer, a tunable, near-zero net stress results, and hence results in little or no deformation of the substrate, such as an optic for an extreme ultraviolet (EUV) lithography tool. Buffer-layers have been deposited, for example, between Mo/Si and Mo/Be multilayer films and their associated substrate reducing significantly the stress, wherein the magnitude of the stress is less than 100 MPa and respectively near-normal incidence (5.degree.) reflectance of over 60% is obtained at 13.4 nm and 11.4 nm. The present invention is applicable to crystalline and non-crystalline materials, and can be used at ambient temperatures.

  4. Inorganic-polymer-derived dielectric films

    DOE Patents [OSTI]

    Brinker, C. Jeffrey (Albuquerque, NM); Keefer, Keith D. (Albuquerque, NM); Lenahan, Patrick M. (State College, PA)

    1987-01-01

    A method of coating a substrate with a thin film of a polymer of predetermined porosity comprises depositing the thin film on the substrate from a non-gelled solution comprising at least one hydrolyzable metal alkoxide of a polymeric network forming cation, water, an alcohol compatible with the hydrolysis and the polymerization of the metal alkoxide, and an acid or a base, prior to depositing the film, controlling the structure of the polymer for a given composition of the solution exclusive of the acid or base component and the water component, (a) by adjusting each of the water content, the pH, and the temperature to obtain the desired concentration of alkoxide, and then adjusting the time of standing of the solution prior to lowering the temperature of the solution, and (b) lowering the temperature of the solution after the time of standing to about 15 degrees C. or lower to trap the solution in a state in which, after the depositing step, a coating of the desired porosity will be obtained, and curing the deposited film at a temperature effective for curing whereby there is obtained a thin film of a polymer of a predetermined porosity and corresponding pore size on the substrate.

  5. Hot filament CVD of boron nitride films

    DOE Patents [OSTI]

    Rye, Robert R.

    1992-01-01

    Using a hot filament (.apprxeq.1400.degree. C.) to activate borazine (B.sub.3 N.sub.3 H.sub.6) molecules for subsequent reaction with a direct line-of-sight substrate, transparent boron ntiride films as thick as 25,000 angstroms are grown for a substrate temperature as low as 100.degree. C. The minimum temperature is determined by radiative heating from the adjacent hot filament. The low temperature BN films show no indication of crystallinity with X-ray diffraction (XRD). X-ray photoelectron spectra (XPS) show the films to have a B:N ratio of 0.97:1 with no other XPS detectable impurities above the 0.5% level. Both Raman and infrared (IR) spectroscopy are characteristic of h-BN with small amounts of hydrogen detected as N-H and B-H bands in the IR spectrum. An important feature of this method is the separation and localization of the thermal activation step at the hot filament from the surface reaction and film growth steps at the substrate surface. This allows both higher temperature thermal activation and lower temperature film growth.

  6. Nuclear cask testing films misleading and misused

    SciTech Connect (OSTI)

    Audin, L.

    1991-10-01

    In 1977 and 1978, Sandia National Laboratories, located in Albuquerque, New Mexico, and operated for the US Department of Energy (DOE), filmed a series of crash and fire tests performed on three casks designed to transport irradiated nuclear fuel assemblies. While the tests were performed to assess the applicability of scale and computer modeling techniques to actual accidents, films of them were quickly pressed into service by the DOE and nuclear utilities as ``proof`` to the public of the safety of the casks. In the public debate over the safety of irradiated nuclear fuel transportation, the films have served as the mainstay for the nuclear industry. Although the scripts of all the films were reviewed by USDOE officials before production, they contain numerous misleading concepts and images, and omit significant facts. The shorter versions eliminated qualifying statements contained in the longer version, and created false impressions. This paper discusses factors which cast doubt on the veracity of the films and the results of the tests.

  7. Electrohydrodynamic instabilities in thin liquid trilayer films

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Roberts, Scott A.; Kumar, Satish

    2010-12-09

    Experiments by Dickey and Leach show that novel pillar shapes can be generated from electrohydrodynamic instabilities at the interfaces of thin polymer/polymer/air trilayer films. In this paper, we use linear stability analysis to investigate the effect of free charge and ac electric fields on the stability of trilayer systems. Our work is also motivated by our recent theoretical study which demonstrates how ac electric fields can be used to increase control over the pillar formation process in thin liquid bilayer films. For perfect dielectric films, the effect of an AC electric field can be understood by considering an equivalent DCmore » field. Leaky dielectric films yield pillar configurations that are drastically different from perfect dielectric films, and AC fields can be used to control the location of free charge within the trilayer system. This can alter the pillar instability modes and generate smaller diameter pillars when conductivities are mismatched. The results presented may be of interest for the creation of complex topographical patterns on polymer coatings and in microelectronics.« less

  8. Electrohydrodynamic instabilities in thin liquid trilayer films

    SciTech Connect (OSTI)

    Roberts, Scott A.; Kumar, Satish

    2010-01-01

    Experiments by Dickey and Leach show that novel pillar shapes can be generated from electrohydrodynamic instabilities at the interfaces of thin polymer/polymer/air trilayer films. In this paper, we use linear stability analysis to investigate the effect of free charge and ac electric fields on the stability of trilayer systems. Our work is also motivated by our recent theoretical study which demonstrates how ac electric fields can be used to increase control over the pillar formation process in thin liquid bilayer films. For perfect dielectric films, the effect of an AC electric field can be understood by considering an equivalent DC field. Leaky dielectric films yield pillar configurations that are drastically different from perfect dielectric films, and AC fields can be used to control the location of free charge within the trilayer system. This can alter the pillar instability modes and generate smaller diameter pillars when conductivities are mismatched. The results presented here may be of interest for the creation of complex topographical patterns on polymer coatings and in microelectronics.

  9. Optimal design of one-dimensional photonic crystal back reflectors for thin-film silicon solar cells

    SciTech Connect (OSTI)

    Chen, Peizhuan; Hou, Guofu Zhang, Jianjun Zhang, Xiaodan; Zhao, Ying

    2014-08-14

    For thin-film silicon solar cells (TFSC), a one-dimensional photonic crystal (1D PC) is a good back reflector (BR) because it increases the total internal reflection at the back surface. We used the plane-wave expansion method and the finite difference time domain (FDTD) algorithm to simulate and analyze the photonic bandgap (PBG), the reflection and the absorption properties of a 1D PC and to further explore the optimal 1D PC design for use in hydrogenated amorphous silicon (a-Si:H) solar cells. With identified refractive index contrast and period thickness, we found that the PBG and the reflection of a 1D PC are strongly influenced by the contrast in bilayer thickness. Additionally, light coupled to the top three periods of the 1D PC and was absorbed if one of the bilayers was absorptive. By decreasing the thickness contrast of the absorptive layer relative to the non-absorptive layer, an average reflectivity of 96.7% was achieved for a 1D PC alternatively stacked with a-Si:H and SiO{sub 2} in five periods. This reflectivity was superior to a distributed Bragg reflector (DBR) structure with 93.5% and an Ag film with 93.4%. n-i-p a-Si:H solar cells with an optimal 1D PC-based BR offer a higher short-circuit current density than those with a DBR-based BR or an AZO/Ag-based BR. These results provide new design rules for photonic structures in TFSC.

  10. Properties of molecular beam epitaxy grown Eu{sub x}(transition metal){sub y} films (transition metals: Mn, Cr)

    SciTech Connect (OSTI)

    Balin, K.; Nowak, A.; Gibaud, A.; Szade, J.; Celinski, Z.

    2011-04-01

    The electronic and crystallographic structures, as well as the magnetic properties, of Eu{sub x}(transition metal){sub y} (transition metals: Mn, Cr) thin films grown by molecular beam epitaxy were studied. Relative changes of the Eu/Mn and Eu/Cr ratios derived from the XPS lines, as well as x-ray reflectivity, indicate mixing of the Eu/Mn and Eu/Cr layers. Valency transitions from Eu{sup 2+} to Eu{sup 3+} were observed in both systems for most studied stoichiometries. A transition to a magnetically ordered phase was observed at 15 K, 40 K, and 62 K for selected films in the Eu-Mn system, and at 50 K for the film with a Eu/Cr ratio of 0.5.

  11. Humidity-dependent compression-induced glass transition of the air–water interfacial Langmuir films of poly(D,L-lactic acid-ran-glycolic acid) (PLGA)

    SciTech Connect (OSTI)

    Kim, Hyun Chang; Lee, Hoyoung; Jung, Hyunjung; Choi, Yun -Hwa; Meron, Mati; Lin, Binhua; Bang, Joona; Won, You -Yeon

    2015-08-26

    Constant rate compression isotherms of the air–water interfacial Langmuir films of poly(D,L-lactic acid-ran-glycolic acid) (PLGA)show a distinct feature of an exponential increase in surface pressure in the high surface polymer concentration regime. We have previously demonstrated that this abrupt increase in surface pressure is linked to the glass transition of the polymer film, but the detailed mechanism of this process is not understood. In order to obtain a molecular-level understanding of this behavior, we performed extensive characterizations of the surface mechanical, structural and rheological properties of Langmuir PLGA films at the air–water interface, using combined experimental techniques including the Langmuir film balance, X-ray reflectivity and double-wall-ring interfacial rheometry methods.

  12. Fresnel reflection from a cavity with net roundtrip gain

    SciTech Connect (OSTI)

    Mansuripur, Tobias S.; Mansuripur, Masud

    2014-03-24

    A planewave incident on an active etalon with net roundtrip gain may be expected to diverge in field amplitude, yet applying the Fresnel formalism to Maxwell's equations admits a convergent solution. We describe this solution mathematically and provide additional insight by demonstrating the response of such a cavity to an incident beam of light. Cavities with net roundtrip gain have often been overlooked in the literature, and a clear understanding of their behavior yields insight to negative refraction in nonmagnetic media, a duality between loss and gain, amplified total internal reflection, and the negative-index lens.

  13. Film | Center for Gas SeparationsRelevant to Clean Energy Technologies |

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Blandine Jerome Film Previous Next List View the new World Energy TV film about the CGS!

  14. The effect of cesium carbonate on 1-(3-methoxycarbonyl)propyl-1-phenyl[6,6]C61 aggregation in films

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Lindemann, William R.; Wang, Wenjie; Fungura, Fadzai; Shinar, Joseph; Shinar, Ruth; Vaknin, David

    2014-11-11

    Surface-pressure isotherms, X-ray reflectivity, and X-ray near-total reflection fluorescence were used to study the properties of 1-(3-methoxycarbonyl)propyl-1-phenyl[6,6]C61 (PCBM) that was pre-mixed with cesium carbonate and spread as a film at the air-water interface. The pre-mixed PCBM with cesium carbonate demonstrated a strikingly strong effect on the organization of the film. Whereas films formed from pure PCBM solution were rough due to strong inter-molecular interactions, the films formed from the mixture were much smoother. This indicates that the cesium carbonate moderates the inter-molecular interactions among PCBM molecules, hinting that the cesium diffusion observed in inverted organic photovoltaics and the likely ensuingmore » ionic Cs-PCBM interaction decrease aggregation tendency of PCBM. As a result, this implies that the use of cesium salts affects the morphology of the organic layer and consequently improves the efficiency of these devices.« less

  15. Spray forming polymer membranes, coatings and films

    DOE Patents [OSTI]

    McHugh, Kevin M.; Watson, Lloyd D.; McAtee, Richard E.; Ploger, Scott A.

    1993-01-01

    A method of forming a polymer film having controlled physical and chemical characteristics, wherein a plume of nebulized droplets of a polymer or polymer precursor is directed toward a substrate from a converging/diverging nozzle having a throat at which the polymer or a precursor thereof is introduced and an exit from which the nebulized droplets of the polymer or precursor thereof leave entrained in a carrier gas. Relative movement between the nozzle and the substrate is provided to form a polymer film. Physical and chemical characteristics can be controlled by varying the deposition parameters and the gas and liquid chemistries. Semipermeable membranes of polyphosphazene films are disclosed, as are a variety of other polymer systems, both porous and non-porous.

  16. Water Clustering on Nanostructured Iron Oxide Films

    SciTech Connect (OSTI)

    Merte, L. R.; Bechstein, Ralf; Peng, Guowen; Rieboldt, Felix; Farberow, Carrie A.; Zeuthen, Helene; Knudsen, Jan; Laegsgaard, E.; Wendt, Stefen; Mavrikakis, Manos; Besenbacher, Fleming

    2014-06-30

    The adhesion of water to solid surfaces is characterized by the tendency to balance competing moleculemolecule and moleculesurface interactions. Hydroxyl groups form strong hydrogen bonds to water molecules and are known to substantially influence the wetting behaviour of oxide surfaces, but it is not well-understood how these hydroxyl groups and their distribution on a surface affect the molecular-scale structure at the interface. Here we report a study of water clustering on a moire-structured iron oxide thin film with a controlled density of hydroxyl groups. While large amorphous monolayer islands form on the are film, the hydroxylated iron oxide film acts as a hydrophilic nanotemplate, causing the formation of a regular array of ice-like hexameric nanoclusters. The formation of this ordered phase is localized at the nanometre scale; with increasing water coverage, ordered and amorphous water are found to coexist at adjacent hydroxylated and hydroxyl-free domains of the moire structure.

  17. Method for synthesizing thin film electrodes

    DOE Patents [OSTI]

    Boyle, Timothy J.

    2007-03-13

    A method for making a thin-film electrode, either an anode or a cathode, by preparing a precursor solution using an alkoxide reactant, depositing multiple thin film layers with each layer approximately 500 1000 .ANG. in thickness, and heating the layers to above 600.degree. C. to achieve a material with electrochemical properties suitable for use in a thin film battery. The preparation of the anode precursor solution uses Sn(OCH.sub.2C(CH.sub.3).sub.3).sub.2 dissolved in a solvent in the presence of HO.sub.2CCH.sub.3 and the cathode precursor solution is formed by dissolving a mixture of (Li(OCH.sub.2C(CH.sub.3).sub.3)).sub.8 and Co(O.sub.2CCH.sub.3).H.sub.2O in at least one polar solvent.

  18. Spray forming polymer membranes, coatings and films

    DOE Patents [OSTI]

    McHugh, K.M.; Watson, L.D.; McAtee, R.E.; Ploger, S.A.

    1993-10-12

    A method is described for forming a polymer film having controlled physical and chemical characteristics, wherein a plume of nebulized droplets of a polymer or polymer precursor is directed toward a substrate from a converging/diverging nozzle having a throat at which the polymer or a precursor thereof is introduced and an exit from which the nebulized droplets of the polymer or precursor thereof leave entrained in a carrier gas. Relative movement between the nozzle and the substrate is provided to form a polymer film. Physical and chemical characteristics can be controlled by varying the deposition parameters and the gas and liquid chemistries. Semipermeable membranes of polyphosphazene films are disclosed, as are a variety of other polymer systems, both porous and non-porous. 4 figures.

  19. Thin Film Transistors On Plastic Substrates

    DOE Patents [OSTI]

    Carey, Paul G.; Smith, Patrick M.; Sigmon, Thomas W.; Aceves, Randy C.

    2004-01-20

    A process for formation of thin film transistors (TFTs) on plastic substrates replaces standard thin film transistor fabrication techniques, and uses sufficiently lower processing temperatures so that inexpensive plastic substrates may be used in place of standard glass, quartz, and silicon wafer-based substrates. The silicon based thin film transistor produced by the process includes a low temperature substrate incapable of withstanding sustained processing temperatures greater than about 250.degree. C., an insulating layer on the substrate, a layer of silicon on the insulating layer having sections of doped silicon, undoped silicon, and poly-silicon, a gate dielectric layer on the layer of silicon, a layer of gate metal on the dielectric layer, a layer of oxide on sections of the layer of silicon and the layer of gate metal, and metal contacts on sections of the layer of silicon and layer of gate metal defining source, gate, and drain contacts, and interconnects.

  20. Vibration welding system with thin film sensor

    DOE Patents [OSTI]

    Cai, Wayne W; Abell, Jeffrey A; Li, Xiaochun; Choi, Hongseok; Zhao, Jingzhou

    2014-03-18

    A vibration welding system includes an anvil, a welding horn, a thin film sensor, and a process controller. The anvil and horn include working surfaces that contact a work piece during the welding process. The sensor measures a control value at the working surface. The measured control value is transmitted to the controller, which controls the system in part using the measured control value. The thin film sensor may include a plurality of thermopiles and thermocouples which collectively measure temperature and heat flux at the working surface. A method includes providing a welder device with a slot adjacent to a working surface of the welder device, inserting the thin film sensor into the slot, and using the sensor to measure a control value at the working surface. A process controller then controls the vibration welding system in part using the measured control value.

  1. Pd conductor for thick film hydrogen sensor

    SciTech Connect (OSTI)

    Felten, J.J.; Hoffheins, B.S.; Lauf, R.J.

    1996-12-31

    Cooperation between a materials developer and sensor designers has resulted in a palladium conductor used ro design and build a new hydrogen sensor that has superior performance characteristics and is also inexpensive to manufacture. Material characteristics give it faster response time and greater thermal/mechanical stability. The thick film palladium conductor paste, which can be fired at 850{degrees}C-950{degrees}C, has provided device designers a practical conductor paste with which to produce the improved sensor. The conductor uses a high surface area Pd powder combined with a binder glass that is chemically very inert, which combination produces a porous conductor that has good adhesion and chemical resistance. The current sensor design consists of three or four thick film Layers. Because of the flexibility of thick film techniques, the sensor element can be configured to any desired size and shape for specific instrument needs.

  2. Mesoscale morphologies in polymer thin films.

    SciTech Connect (OSTI)

    Ramanathan, M.; Darling, S. B. (Center for Nanoscale Materials)

    2011-06-01

    In the midst of an exciting era of polymer nanoscience, where the development of materials and understanding of properties at the nanoscale remain a major R&D endeavor, there are several exciting phenomena that have been reported at the mesoscale (approximately an order of magnitude larger than the nanoscale). In this review article, we focus on mesoscale morphologies in polymer thin films from the viewpoint of origination of structure formation, structure development and the interaction forces that govern these morphologies. Mesoscale morphologies, including dendrites, holes, spherulites, fractals and honeycomb structures have been observed in thin films of homopolymer, copolymer, blends and composites. Following a largely phenomenological level of description, we review the kinetic and thermodynamic aspects of mesostructure formation outlining some of the key mechanisms at play. We also discuss various strategies to direct, limit, or inhibit the appearance of mesostructures in polymer thin films as well as an outlook toward potential areas of growth in this field of research.

  3. Preparation of thin film high temperature superconductors

    SciTech Connect (OSTI)

    VenKatesan, X.X.T.; Li, Q.; Findikoglu, A.; Hemmick, D. . Dept. of Physics); Wu, X.D. ); Inam, A.; Chang, C.C.; Ramesh, R.; Hwang, D.M.; Ravi, T.S.; Etemad, S.; Martinez, J.A.; Wilkens, B. )

    1991-03-01

    This paper addresses fundamental issues in preparing high quality high T{sub c} YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} thin films. The techniques of inverted cylindrical magnetron sputtering and pulsed laser deposition are chosen as successful examples to illustrate how the key problems can be solved. The fabrication of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/PrBa{sub 2}Cu{sub 3}O{sub 7{minus}x} superlattices where superconductivity in a single unit cell layer of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} was observed demonstrates the state of the art of thin film deposition of high T{sub c} materials. Systematic variations of the deposition parameters result in changes of superconducting and structural properties of the films that correlate with their microwave and infrared characteristics.

  4. Shin Etsu Film Co Ltd | Open Energy Information

    Open Energy Info (EERE)

    Film Co Ltd Jump to: navigation, search Name: Shin-Etsu Film Co Ltd Place: Tokyo, Japan Zip: 101-0047 Product: Japan-based firm that manufactures semiconductor and multicrystalline...

  5. Antiperovskite Li 3 OCl superionic conductor films for solid...

    Office of Scientific and Technical Information (OSTI)

    Antiperovskite Li 3 OCl superionic conductor films for solid-state Li-ion batteries Citation Details In-Document Search Title: Antiperovskite Li 3 OCl superionic conductor films ...

  6. Precursors for the polymer-assisted deposition of films (Patent...

    Office of Scientific and Technical Information (OSTI)

    Precursors for the polymer-assisted deposition of films Citation Details In-Document Search Title: Precursors for the polymer-assisted deposition of films You are accessing a ...

  7. Polymer-assisted aqueous deposition of metal oxide films (Patent...

    Office of Scientific and Technical Information (OSTI)

    Polymer-assisted aqueous deposition of metal oxide films Title: Polymer-assisted aqueous deposition of metal oxide films An organic solvent-free process for deposition of metal ...

  8. Subkilovolt response of Kodak T max XUV film

    SciTech Connect (OSTI)

    Dittmore, C.; Stoering, J.P. ); Gullikson, E. )

    1990-02-08

    A calibration of Kodak T max 100 XUV film at six x-ray energies ranging from 0.27 keV to 1.49 keV has been concluded. The primary purpose was to compare the sensitivity of this film to that of Kodak type 101-07 XUV film in order to appraise the feasibility of replacing the type 101-07 film with the type T max 100 film. In addition to being considerably less expensive, the T max 100 film is less disposed to abrasion from handling. A secondary objective was to provide a base for further response measurements should the T max 100 film prove to be an acceptable substitute for the type 101-07 film. 10 figs., 2 tabs.

  9. Fluorination of amorphous thin-film materials with xenon fluoride

    DOE Patents [OSTI]

    Weil, Raoul B. (Haifa, IL)

    1988-01-01

    A method is disclosed for producing fluorine-containing amorphous semiconductor material, preferably comprising amorphous silicon. The method includes depositing amorphous thin-film material onto a substrate while introducing xenon fluoride during the film deposition process.

  10. SAW determination of surface area of thin films

    DOE Patents [OSTI]

    Frye, Gregory C.; Martin, Stephen J.; Ricco, Antonio J.

    1990-01-01

    N.sub.2 adsorption isotherms are measured from thin films on SAW devices. The isotherms may be used to determine the surface area and pore size distribution of thin films.

  11. Ferroelectric PLZT thick films grown by poly(1-vinylpyrrolidone...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    PLZT thick films grown by poly(1-vinylpyrrolidone-co-vinyl acetate) (PVPVA)-modified sol-gel process Title Ferroelectric PLZT thick films grown by poly(1-vinylpyrrolidone-co-vi...

  12. Fluorination of amorphous thin-film materials with xenon fluoride

    DOE Patents [OSTI]

    Weil, R.B.

    1987-05-01

    A method is disclosed for producing fluorine-containing amorphous semiconductor material, preferably comprising amorphous silicon. The method includes depositing amorphous thin-film material onto a substrate while introducing xenon fluoride during the film deposition process.

  13. MultiLayer solid electrolyte for lithium thin film batteries...

    Office of Scientific and Technical Information (OSTI)

    Patent: MultiLayer solid electrolyte for lithium thin film batteries Citation Details In-Document Search Title: MultiLayer solid electrolyte for lithium thin film batteries A ...

  14. Solvothermal Thin Film Deposition of Electron Blocking Layers | ANSER

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Center | Argonne-Northwestern National Laboratory Solvothermal Thin Film Deposition of Electron Blocking Layers Home > Research > ANSER Research Highlights > Solvothermal Thin Film Deposition of Electron Blocking Layers

  15. Charge Transport in Thin Film Ionomers | Argonne Leadership Computing...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Model of a thin film Nafion ionomer (green translucent surface) in a fuel cell membranecatalyst interface Model of a thin film Nafion ionomer (green translucent surface) in a fuel...

  16. Guided Self-Assembly of Gold Thin Films

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Guided Self-Assembly of Gold Thin Films Guided Self-Assembly of Gold Thin Films Print Wednesday, 21 November 2012 12:18 Nanoparticles-man-made atoms with unique optical,...

  17. Thin film dielectric composite materials

    DOE Patents [OSTI]

    Jia, Quanxi; Gibbons, Brady J.; Findikoglu, Alp T.; Park, Bae Ho

    2002-01-01

    A dielectric composite material comprising at least two crystal phases of different components with TiO.sub.2 as a first component and a material selected from the group consisting of Ba.sub.1-x Sr.sub.x TiO.sub.3 where x is from 0.3 to 0.7, Pb.sub.1-x Ca.sub.x TiO.sub.3 where x is from 0.4 to 0.7, Sr.sub.1-x Pb.sub.x TiO.sub.3 where x is from 0.2 to 0.4, Ba.sub.1-x Cd.sub.x TiO.sub.3 where x is from 0.02 to 0.1, BaTi.sub.1-x Zr.sub.x O.sub.3 where x is from 0.2 to 0.3, BaTi.sub.1-x Sn.sub.x O.sub.3 where x is from 0.15 to 0.3, BaTi.sub.1-x Hf.sub.x O.sub.3 where x is from 0.24 to 0.3, Pb.sub.1-1.3x La.sub.x TiO.sub.3+0.2x where x is from 0.23 to 0.3, (BaTiO.sub.3).sub.x (PbFeo.sub.0.5 Nb.sub.0.5 O.sub.3).sub.1-x where x is from 0.75 to 0.9, (PbTiO.sub.3).sub.- (PbCo.sub.0.5 W.sub.0.5 O.sub.3).sub.1-x where x is from 0.1 to 0.45, (PbTiO.sub.3).sub.x (PbMg.sub.0.5 W.sub.0.5 O.sub.3).sub.1-x where x is from 0.2 to 0.4, and (PbTiO.sub.3).sub.x (PbFe.sub.0.5 Ta.sub.0.5 O.sub.3).sub.1-x where x is from 0 to 0.2, as the second component is described. The dielectric composite material can be formed as a thin film upon suitable substrates.

  18. Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy

    SciTech Connect (OSTI)

    Sutter, P. Sutter, E.

    2014-09-01

    We assess scanning electron microscopy (SEM) and Auger electron spectroscopy (AES) for thickness measurements on few-layer hexagonal boron nitride (h-BN), the layered dielectric of choice for integration with graphene and other two-dimensional materials. Observations on h-BN islands with large, atomically flat terraces show that the secondary electron intensity in SEM reflects monolayer height changes in films up to least 10 atomic layers thickness. From a quantitative analysis of AES data, the energy-dependent electron escape depth in h-BN films is deduced. The results show that AES is suitable for absolute thickness measurements of few-layer h-BN of 1 to 6 layers.

  19. Benchmark Evaluation of Plutonium Hemispheres Reflected by Steel and Oil

    SciTech Connect (OSTI)

    John Darrell Bess

    2008-06-01

    During the period from June 1967 through September 1969 a series of critical experiments was performed at the Rocky Flats Critical Mass Laboratory with spherical and hemispherical plutonium assemblies as nested hemishells as part of a Nuclear Safety Facility Experimental Program to evaluate operational safety margins for the Rocky Flats Plant. These assemblies were both bare and fully or partially oil-reflected. Many of these experiments were subcritical with an extrapolation to critical configurations or critical at a particular oil height. Existing records reveal that 167 experiments were performed over the course of 28 months. Unfortunately, much of the data was not recorded. A reevaluation of the experiments had been summarized in a report for future experimental and computational analyses. This report examines only fifteen partially oil-reflected hemispherical assemblies. Fourteen of these assemblies also had close-fitting stainless-steel hemishell reflectors, used to determine the effective critical reflector height of oil with varying steel-reflector thickness. The experiments and their uncertainty in keff values were evaluated to determine their potential as valid criticality benchmark experiments of plutonium.

  20. Diffuse reflectance FTIR of stains on grit blasted metals

    SciTech Connect (OSTI)

    Powell, G.L.; Hallman, R.L. Jr.; Cox, R.L.

    1997-08-09

    Diffuse reflectance mid-infrared Fourier transform (DRIFT) spectroscopy has been applied to the detection of oil contamination on grit-blasted metals. The object of this application is to detect and discriminate between silicone and hydrocarbon oil contamination at levels approaching 10 mg/m{sup 2}. A portable FTIR spectrometer with dedicated diffuse reflectance optics was developed for this purpose. Using translation devices positioned by instructions from the spectrometer operating system, images of macroscopic substrates were produced with millimeter spatial resolution. The pixels that comprise an image are each a full mid-infrared spectrum with excellent signal-to-noise, each determined as individual files and uniquely saved to disc. Reduced spectra amplitudes, based on peak height, area, or other chemometric techniques, mapped as a function of the spatial coordinates of the pixel are used to display the image. This paper demonstrates the application of the technique to the analysis of stains on grit-blasted metals, including the calibration of the method, the inspection of substrates, and the migration of oil contamination.

  1. Progress toward achieving a commercially viable solar reflective material

    SciTech Connect (OSTI)

    Kennedy, C.E.; Smilgys, R.V. |

    1998-06-01

    Solar thermal technologies use large mirrors to concentrate sunlight for renewable power generation. The development of advanced reflector materials is important to the viability of electricity production by solar thermal energy systems. The reflector materials must be low in cost and maintain high specular reflectance for extended lifetimes under severe outdoor environments. Production processes associated with candidate materials must be scalable to mass production techniques. A promising low-cost construction uses a stainless steel foil substrate with a silver reflective layer protected by an optically transparent oxide topcoat. Thick (2 to 4 micron), dense alumina coatings provide durable protective layers. The excellent performance of alumina-coated reflector materials in outdoor and accelerated testing suggests that a larger field trial of the material is warranted. The key to producing a greater quantity of material for field deployment and testing without incurring substantial capital is the use of a chilled drum coater. An existing chamber is being modified, and the deposition rate will be increased prior to the installation of a drum coater to produce 1-ft wide by 10-ft long strips of solar reflector material. The production and performance of these materials are discussed.

  2. Oriented niobate ferroelectric thin films for electrical and optical devices and method of making such films

    DOE Patents [OSTI]

    Wessels, B.W.; Nystrom, M.J.

    1998-05-19

    Sr{sub x}Ba{sub 1{minus}x}Nb{sub 2}O{sub 6}, where x is greater than 0.25 and less than 0.75, and KNbO{sub 3} ferroelectric thin films metalorganic chemical vapor deposited on amorphous or crystalline substrate surfaces to provide a crystal axis of the film exhibiting a high dielectric susceptibility, electro-optic coefficient, and/or nonlinear optic coefficient oriented preferentially in a direction relative to a crystalline or amorphous substrate surface are disclosed. Such films can be used in electronic, electro-optic, and frequency doubling components. 8 figs.

  3. Oriented niobate ferroelectric thin films for electrical and optical devices and method of making such films

    DOE Patents [OSTI]

    Wessels, Bruce W.; Nystrom, Michael J.

    1998-01-01

    Sr.sub.x Ba.sub.1-x Nb.sub.2 O.sub.6, where x is greater than 0.25 and less than 0.75, and KNbO.sub.3 ferroelectric thin films metalorganic chemical vapor deposited on amorphous or crystalline substrate surfaces to provide a crystal axis of the film exhibiting a high dielectric susceptibility, electro-optic coefficient, and/or nonlinear optic coefficient oriented preferentially in a direction relative to a crystalline or amorphous substrate surface. Such films can be used in electronic, electro-optic, and frequency doubling components.

  4. Laser image recording on detonation nanodiamond films

    SciTech Connect (OSTI)

    Mikheev, G M; Mikheev, K G; Mogileva, T N; Puzyr, A P; Bondar, V S

    2014-01-31

    A focused He Ne laser beam is shown to cause local blackening of semitransparent detonation nanodiamond (DND) films at incident power densities above 600 W cm{sup -2}. Data obtained with a Raman spectrometer and low-power 632.8-nm laser source indicate that the blackening is accompanied by a decrease in broadband background luminescence and emergence of sharp Raman peaks corresponding to the structures of nanodiamond and sp{sup 2} carbon. The feasibility of image recording on DND films by a focused He Ne laser beam is demonstrated. (letters)

  5. Morphology in electrochemically grown conducting polymer films

    DOE Patents [OSTI]

    Rubinstein, I.; Gottesfeld, S.; Sabatani, E.

    1992-04-28

    A conducting polymer film with an improved space filling is formed on a metal electrode surface. A self-assembling monolayer is formed directly on the metal surface where the monolayer has a first functional group that binds to the metal surface and a second chemical group that forms a chemical bonding site for molecules forming the conducting polymer. The conducting polymer is then conventionally deposited by electrochemical deposition. In one example, a conducting film of polyaniline is formed on a gold electrode surface with an intermediate monolayer of p-aminothiophenol. 2 figs.

  6. Morphology in electrochemically grown conducting polymer films

    DOE Patents [OSTI]

    Rubinstein, Israel; Gottesfeld, Shimshon; Sabatani, Eyal

    1992-01-01

    A conducting polymer film with an improved space filling is formed on a metal electrode surface. A self-assembling monolayer is formed directly on the metal surface where the monolayer has a first functional group that binds to the metal surface and a second chemical group that forms a chemical bonding site for molecules forming the conducting polymer. The conducting polymer is then conventioonally deposited by electrochemical deposition. In one example, a conducting film of polyaniline is formed on a gold electrode surface with an intermediate monolayer of p-aminothiophenol.

  7. Thin-Film Material Science and Processing | Materials Science | NREL

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Thin-Film Material Science and Processing Photo of a stainless steel piece of equipment with multiple hoses and other equipment attached. NREL's expertise focuses on using thin films to create and enable technologically useful applications. For renewable energy, a prime example of this research is thin-film photovoltaics (PV). Thin films are important because they offer the potential for low-cost processing with minimal material usage while fulfilling application requirements. Importantly, this

  8. Multifunctional thin film surface (Patent) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Multifunctional thin film surface Citation Details In-Document Search Title: Multifunctional thin film surface A thin film with multiple binding functionality can be prepared on an electrode surface via consecutive electroreduction of two or more aryl-onium salts with different functional groups. This versatile and simple method for forming multifunctional surfaces provides an effective means for immobilization of diverse molecules at close proximities. The multifunctional thin film has

  9. A Sensitivity Analysis of a Thin Film Conductivity Estimation Method

    Office of Scientific and Technical Information (OSTI)

    (Conference) | SciTech Connect Conference: A Sensitivity Analysis of a Thin Film Conductivity Estimation Method Citation Details In-Document Search Title: A Sensitivity Analysis of a Thin Film Conductivity Estimation Method An analysis method was developed for determining the thermal conductivity of a thin film on a substrate of known thermal properties using the flash diffusivity method. In order to determine the thermal conductivity of the film using this method, the volumetric heat

  10. Global POF Shrink Film Industry 2015 Market Research Report ...

    Open Energy Info (EERE)

    POF Shrink Film Industry 2015 Market Research Report Home There are currently no posts in this category. Syndicate content...

  11. Process for leveling film surfaces and products thereof

    DOE Patents [OSTI]

    Birkmire, R.W.; McCandless, B.E.

    1990-03-20

    Semiconductor films and photovoltaic devices prepared therefrom are provided wherein the semiconductor films have a specular surface with a texture less than about 0.25 micron greater than the average planar film surface and wherein the semiconductor films are surface modified by exposing the surface to an aqueous solution of bromine containing an acid or salt and continuing such exposure for a time sufficient to etch the surface. 8 figs.

  12. DOE - NNSA/NFO -- Nevada Field Office Film Library

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Films > Current NFO Films NNSA/NFO Language Options U.S. DOE/NNSA - Nevada Field Office Nevada Field Office Current Film Library Instructions: Click the Document Title or Thumbnail to view the video and details Click the Title, Category, or Date table header links to sort the information. The default sort is by Category Current program Films cannot be ordered Name Title Category Date Pic Amchitka Amchitka Island Remediation Activities EM - Environmental Restoration September 1, 2001

  13. Thermal Conductivity in Nanocrystalline Ceria Thin Films (Journal Article)

    Office of Scientific and Technical Information (OSTI)

    | SciTech Connect Thermal Conductivity in Nanocrystalline Ceria Thin Films Citation Details In-Document Search Title: Thermal Conductivity in Nanocrystalline Ceria Thin Films The thermal conductivity of nanocrystalline ceria films grown by unbalanced magnetron sputtering is determined as a function of temperature using laser-based modulated thermoreflectance. The films exhibit significantly reduced conductivity compared with stoichiometric bulk CeO2. A variety of microstructure imaging

  14. Fabricating Dielectric Ceramic Films on Copper Foils | Argonne National

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Laboratory Fabricating Dielectric Ceramic Films on Copper Foils Technology available for licensing: A method for coating a ceramic film on copper foil. Process creates higher performing and more reliable embedded circuit boards Can be used to prepare ceramic materials consisting of various compounds, including lead, magnesium, barium, zirconium and, titanium PDF icon dielectric_ceramic_films

  15. Thin film with oriented cracks on a flexible substrate

    DOE Patents [OSTI]

    Feng, Bao; McGilvray, Andrew; Shi, Bo

    2010-07-27

    A thermoelectric film is disclosed. The thermoelectric film includes a substrate that is substantially electrically non-conductive and flexible and a thermoelectric material that is deposited on at least one surface of the substrate. The thermoelectric film also includes multiple cracks oriented in a predetermined direction.

  16. High Temperature Polymer Capacitor Dielectric Films | Department of Energy

    Broader source: Energy.gov (indexed) [DOE]

    1 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies Program Annual Merit Review and Peer Evaluation PDF icon ape009_dirk_2011_o.pdf More Documents & Publications High Temperature Polymer Capacitor Dielectric Films High Temperature Polymer Capacitor Dielectric Films High Temperature Polymer Capacitor Dielectric Films

  17. Strategies for Electrooptic Film Fabrication. Influence of Pyrrole-Pyridine-Based Dibranched Chromophore Architecture on Covalent Self-Assembly, Thin-Film Microstructure, and Nonlinear Optical Response

    SciTech Connect (OSTI)

    Facchetti,A.; Beverina, L.; van der Boom, M.; Shukla, A.; Dutta, P.; Evmenenko, G.; Marks, T.; Pagani, G.

    2006-01-01

    The new dibranched, heterocyclic 'push-pull' chromophores bis{l_brace}1-(pyridin-4-yl)-2-[2-(N-methylpyrrol-5-yl)]ethane{r_brace}methane (1), 1-(pyrid-4-yl)-2-(N-methyl-5-formylpyrrol-2-yl)ethylene (2), {l_brace}1-(N-methylpyridinium-4-yl)-2-[2-(N-methylpyrrol-5-yl)]ethane{r_brace}{l_brace}[1-(pyridin-4-yl)-2-[2-(N-methylpyrrol-5-yl)]ethane]{r_brace}methane (3), N-methyl-2-[1-(N-methylpyrid-4-yl)ethen-2-yl]-5-[pyrid-4-yl]ethen-2-yl-pyrrole iodide (4), bis{l_brace}1-(N-methyl-4-pyridinio)-2-[2-(N-methylpyrrol-5-yl)]ethane{r_brace}methane iodide (5), and N-methyl-2,5-[1-(N-methylpyrid-4-yl)ethen-2-yl]pyrrole iodide (6) have been synthesized and characterized. The neutral (1 and 2) and monomethyl salts (3 and 4) undergo chemisorptive reaction with iodobenzyl-functionalized surfaces to afford chromophore monolayers SA-1/SA-2 and SA-3/SA-4, respectively. Molecular structures and other physicochemical properties have been defined by 1H NMR, optical spectroscopy, and XRD. Thin-film characterization by a variety of techniques (optical spectroscopy, specular X-ray reflectivity, atomic force microscopy, X-ray photoelectron spectroscopy, and angle-dependent polarized second harmonic generation) underscore the importance of the chromophore molecular architecture as well as film growth method on film microstructure and optical/electrooptic response.

  18. Reduction in Vehicle Temperatures and Fuel Use from Cabin Ventilation, Solar-Reflective Paint, and a New Solar-Reflective Glazing

    SciTech Connect (OSTI)

    Rugh, J.; Chaney, L.; Meyer, J.; Rustagi, M.; Olson, K.; Kogler, R.

    2007-05-01

    An analysis to determine the impact of reducing the thermal load on a vehicle using solar-reflective paint and glazing.

  19. V-142: Oracle Java Reflection API Flaw Lets Remote Users Execute...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    2: Oracle Java Reflection API Flaw Lets Remote Users Execute Arbitrary Code V-142: Oracle Java Reflection API Flaw Lets Remote Users Execute Arbitrary Code April 25, 2013 - 12:14am...

  20. Reflecting the Revised PM 2.5 National Ambient Air Quality Standard...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Reflecting the Revised PM 2.5 National Ambient Air Quality Standard in NEPA Evaluations Reflecting the Revised PM 2.5 National Ambient Air Quality Standard in NEPA Evaluations This...