National Library of Energy BETA

Sample records for beamline operations schedule

  1. Operation Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Operation Schedule Daily Hours of Operation

  2. Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Please contact the beamline staff to schedule data collection. CAMD's operation schedule

  3. Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    beamline long-term schedules can be found on the ALS Beamlines Directory. Photon Source Parameters Brightness curves for bend magnet, superbend, and insertion devices....

  4. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling from

  5. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling from

  6. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling from

  7. Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Micromachining X-ray Lithography Micromachining I (XRLM1), Port 2A, 10 mrad (Updated) X-ray lithography beamline for microfabrication. Two mode of operation, "white" and...

  8. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The GCPCC beamline is located at the Center for Advanced Microstructures and Devices (CAMD), which is operated by Louisiana State University. The CAMD synchrotron is a second generation source that is currently operated at 1.3 GeV with an injection current of 200 mA and 2 fills per day. The GCPCC beamline utilizes 1.5 mrad of the output of a single-pole 7 Tesla super conducting wiggler. The x-rays are collimated vertically by a fixed radius cylindrical mirror, monochromatized by either a

  9. LCLS Operating Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    LCLS Operating Schedule August - December 2009 Ver: 2 103009 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 S Su M T W Th F S Su M T W Th F S...

  10. Beamlines | Advanced Photon Source

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Beamlines Home Beamlines Directory Research Techniques Sectors Directory Status and Schedule Safety and Training Beamlines The Advanced Photon Source consists of 34...

  11. Upcoming Long-Term Operating Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Upcoming Long-Term Operating Schedule Print This schedule is also available as an .xls spreadsheet.

  12. Upcoming Long-Term Operating Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Upcoming Long-Term Operating Schedule Print This schedule is also available as an .xls spreadsheet.

  13. Upcoming Long-Term Operating Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Upcoming Long-Term Operating Schedule Print This schedule is also available as an .xls spreadsheet.

  14. Current Long-Term Operating Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Current Long-Term Operating Schedule Print This schedule is also available as an .xls spreadsheet.

  15. Current Long-Term Operating Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Current Long-Term Operating Schedule Print This schedule is also available as an .xls spreadsheet.

  16. Current Long-Term Operating Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Current Long-Term Operating Schedule Print This schedule is also available as an .xls spreadsheet.

  17. Beamlines & Facilities

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Imaging Group: Beamlines The X-ray Micrscopy and Imaging Group operates several beamlines and facilities. The bending magnet beamline (2-BM) entertaines 2 general user programs in...

  18. LCLS Operating Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    LCLS Operating Schedule August - December 2009 Ver: 2 10/30/09 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 S Su M T W Th F S Su M T W Th F S Su M T W Th F S Su M T W Th F S Su M 0000-0800 MD MD MD MD MD 0800-1600 ROD MD AMO ROD MD AMO 1600-2400 MD MD Commissioning MD MD Comm. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 T W Th F S Su M T W Th F S Su M T W Th F S Su M T W Th F S Su M T W 0000-0800 MD MD MD MD MD MD MD MD

  19. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    For Beamtime scheduling, contact Lisa Bovenkamp

  20. Beamlines Directory | Advanced Photon Source

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines: Find a Beamline Beamlines Directory Research Techniques Sectors Directory Status and Schedule Safety and Training back to Beamlines Directory 120213...

  1. LCLS Operations Schedule January February...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Operations Schedule January February March April May June July August September October November December 2009 Run 1 Oct. 1-Dec. 17 2010 Run 2 Run 3 May 6 - Sep. 13 Oct. 7 - Dec....

  2. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline Every NIF beam starts at the master oscillator. The low-energy beam is amplified in the preamplifier module and then in the power amplifier, the main amplifier, and again...

  3. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline Scientific Applications SAXS/WAXS Solution Scattering Fiber diffraction Anomalous SAXS Source characteristics Bending Magnet Port 6A Electron Beam energy 1.3 GeV Dipole field 1.48 T Characteristic energy 1.66 keV Optics LNLS double crystal monochromator Si 111 and Ge 220 crystals Practical energy range from 3 to 14 keV Distance from source Acceptance 2 mrad Energy resolution dE/E Flux before pinholes = 7 x 109 @ 8keV Flux at sample = Experimental setup 2D control for sample alignment

  4. ALS Operating Schedule on Google Calendar

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Operating Schedule on Google Calendar Print ALS Operating Schedule Your browser does not appear to support JavaScript, but this page needs to use JavaScript to display...

  5. APS User Operations

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Schedules APS Schedule Useful Links Beamline Design Library (former Design Exchange) Machine Status Link Bunch Clock Information APS Systems Status Storage Ring Operating Status...

  6. 4-ID beamline layout

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Sector 4 beamline layout Overview Sector 4 uses a canted undulator straight section to operate two beamlines The 4-ID-C beamline operates between 500 and 3000 eV while the 4-ID-D...

  7. Exhibit D: Mirant Potomac River Schedule of Operations: January and

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    February 2006 | Department of Energy Operations: January and February 2006 Exhibit D: Mirant Potomac River Schedule of Operations: January and February 2006 Docket No. EO-05-01. Exhibit D: Mirant Potomac River Schedule of Operations, January and February 2006 PDF icon Exhibit D: Mirant Potomac River Schedule of Operations More Documents & Publications Exhibit D: Mirant Potomac River Schedule of Unit Operations: January - March 2006 Exhibit D: Mirant Potomac River Schedule of Unit

  8. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: 17 keV transmission though...

  9. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through...

  10. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 3.1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission...

  11. Exhibit D: Mirant Potomac River Schedule of Unit Operations: January -

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    March 2006 | Department of Energy January - March 2006 Exhibit D: Mirant Potomac River Schedule of Unit Operations: January - March 2006 Docket No. EO-05-01: Exhibit D: Mirant Potomac River Schedule of Unit Operations related to Supplement Number 4 of the Operating Plan of Mirant Potomac River, LLC PDF icon Exhibit D: Mirant Potomac River Schedule of Unit Operations More Documents & Publications Exhibit D: Mirant Potomac River Schedule of Unit Operations: Supplement 3, January and

  12. Beamline 29-ID

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    & Milestones IEX Advisory Committees FDR Beamline Information RSXS ARPES APS Ring Status Current APS Schedule Intermediate Energy X-Rays (29-ID): The Intermediate Energy...

  13. Exhibit D: Mirant Potomac River Schedule of Unit Operations:...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Exhibit D: Mirant Potomac River Schedule of Unit Operations: Supplement 4, January - March 2006 Docket No. EO-05-01: Exhibit D: Mirant Potomac River Schedule of Unit Operations in ...

  14. Schedules

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Schedules Schedules Print Current Long-Term Operating Schedule February 2016-June 2016 Upcoming Long-Term Operating Schedule July 2016-December 2016 Past Long-Term Operating Schedules July 2015-January 2016 (.xls) January-June 2015 (.xls) July-December 2014 (.xls) January-June 2014 (.xls) August-December 2013 (.xls) January-July 2013 July-December 2012 January-June 2012 July-December 2011 January-June 2011 July-December 2010 January-June 2010 July-December 2009 January-June 2009 July-December

  15. Exhibit D: Mirant Potomac River Schedule of Operations: January...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Operations: January and February 2006 Exhibit D: Mirant Potomac River Schedule of Operations: January and February 2006 Docket No. EO-05-01. Exhibit D: Mirant Potomac River ...

  16. Exhibit D: Mirant Potomac River Schedule of Unit Operations:...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    January - March 2006 Exhibit D: Mirant Potomac River Schedule of Unit Operations: January - March 2006 Docket No. EO-05-01: Exhibit D: Mirant Potomac River Schedule of Unit ...

  17. Schedules

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Schedules Print Current Long-Term Operating Schedule February 2016-June 2016 Upcoming Long-Term Operating Schedule July 2016-December 2016 Past Long-Term Operating Schedules July 2015-January 2016 (.xls) January-June 2015 (.xls) July-December 2014 (.xls) January-June 2014 (.xls) August-December 2013 (.xls) January-July 2013 July-December 2012 January-June 2012 July-December 2011 January-June 2011 July-December 2010 January-June 2010 July-December 2009 January-June 2009 July-December 2008

  18. Exhibit D: Mirant Potomac River Schedule of Unit Operations:...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Supplement 3, January and February 2006 Exhibit D: Mirant Potomac River Schedule of Unit Operations: Supplement 3, January and February 2006 Docket No. EO-05-01: Exhibit D: Mirant ...

  19. Daily Flight Planning and Operations Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    planning and operations activities will be carried out for each flight of the G-1 and King Air aircraft. These activities are listed separately from preparation of scientific...

  20. 2016 Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    CAMD 2016 User Meeting Schedule Printable Schedule (pdf) Printable Poster Abstracts (pdf) Printable Talk Abstracts (pdf) Friday, April 29th, 2016 CAMD, 6980 Jefferson Highway, Baton Rouge, LA 70806 10:00 AM - 12:20 PM Morning Session Registration near CAMD Conference Room, 2nd office building 10:00 - 11:20 Experiment Hall; Visit Multipole Wiggler Beamlines as well as newly installed or rebuilt beamlines SAXS, 5-m TGM and LEXAS; CAMD Beamline Scientists will be available to discuss capabilities

  1. Conceptual design of the neutral beamline for TPX long pulse operation

    SciTech Connect (OSTI)

    Wright, K.E.; Dahlgren, F.; Fan, H.M.; Grisham, L.R.; Hammersand, F.G.; Kamperschroer, J.H.; Lontai, L.M.; Oldaker, M.E.; Rogoff, P.

    1993-11-01

    The Tokamak Physics Experiment (TPX) will require a minimum of 8.0 megawatts of Neutral Beam beating power to be injected into the plasma for pulse lengths up to one thousand (1000) seconds to meet the experimental objectives. The Neutral Beam Injection System (NBIS) for initial operation on TPX will consist of one neutral beamline (NBL) with three Ion sources. Provisions will be made for a total of three NBLs. The NBIS will provide S.S MW of 120 keV D{sup 0} and 2.S MW of partial-energy D{sup 0} at 60 keV and 40 keV. The system also provides for measuring the neutral beam power, limits excess cold gas from entering the torus, and provides independent power, control, and protection for each individual ion source and accelerating structure. The Neutral Beam/Torus Connecting Duct (NB/TCD) includes a vacuum valve, an electrical insulating break, alignment bellows, vacuum seals, internal energy absorbing protective elements, beam diagnostics and bakeout capability. The NBL support structure will support the NBL, which will weigh approximately 80 tons at the proper elevation and withstand a seismic event. The NBIS currently operational on the Tokamak Fusion Test Reactor (TFTR) at the Princeton Plasma Physics Laboratory (PPPL) is restricted to injection pulse lengths of two (2) seconds by the limited capability of various energy absorbers. This paper describes the modifications and improvements which will be implemented for the TFTR Neutral Beamlines and the NB/TCD to satisfy the TPX requirements.

  2. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes...

  3. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes...

  4. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source...

  5. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes...

  6. APS Beamline 6-ID-B,C

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6-ID-B,C Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-B,C Beamline 6-ID-B,C is operated by the Magnetic Materials Group in the...

  7. APS Beamline 6-ID-B,C

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    B,C Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-B,C Beamline 6-ID-B,C is operated by the Magnetic Materials Group in the X-ray...

  8. APS Beamline 6-ID-D

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    D Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-D Beamline 6-ID-D is operated by the Magnetic Materials Group in the X-ray Science...

  9. APS Beamline 6-ID-D

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    MM-Group Home MMG Advisory Committees 6-ID-D Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-D Beamline 6-ID-D is operated by the...

  10. ARM Intensive Operational Period Scheduled to Validate New NASA Satellite

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 ARM Intensive Operational Period Scheduled to Validate New NASA Satellite Beginning in July, all three ARM sites (Southern Great Plains [SGP], North Slope of Alaska, and Tropical Western Pacific; Figure 1) will participate in the AIRS Validation IOP. This three-month intensive operational period (IOP) will validate data collected by the satellite-based Atmospheric Infrared Sounder (AIRS) recently launched into space. On May 4, the National Aeronautics and Space Administration (NASA) launched

  11. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 3.1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is

  12. SRI2007 Conference - Schedule

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Photo Gallery Manuscript Submission Conference Schedule SRI2007 conference will feature oral and poster sessions on synchrotron-radiation related topics; sources, beamlines,...

  13. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range...

  14. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm...

  15. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational...

  16. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open...

  17. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes...

  18. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3)...

  19. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV...

  20. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  1. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  2. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  3. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  4. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  5. BEAMLINE 14-3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4-3 CURRENT STATUS: This beam line is in design. SUPPORTED TECHNIQUES: Low Energy XAS MAIN SCIENTIFIC DISCIPLINES: % TIME GENERAL USE: SCHEDULING: SOURCE: BEAM LINE SPECIFICATIONS: energy range resolution DE/E spot size flux angular acceptance focused unfocused OPTICS: MONOCHROMATOR: ABSORPTION: INSTRUMENTATION: DATA ACQUISITION AND ANALYSIS: RESPONSIBLE STAFF: BEAM LINE PHONE NUMBER: GENERAL DESCRIPTION: SCIENTIFIC APPLICATIONS / SELECTED RESULTS: April 17, 2009: SSRL Beamline 14 Sees First

  6. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Beamline 5.0.3 Print Tuesday, 20 October 2009 08:36 Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring

  7. Exhibit D: Mirant Potomac River Schedule of Unit Operations: Supplement 4, January- March 2006

    Office of Energy Efficiency and Renewable Energy (EERE)

    Docket No. EO-05-01: Exhibit D: Mirant Potomac River Schedule of Unit Operations in support of Supplement Number 4 to the Operating Plan of Mirant Potomac River, LLC

  8. Exhibit D: Mirant Potomac River Schedule of Unit Operations: Supplement 3, January and February 2006

    Office of Energy Efficiency and Renewable Energy (EERE)

    Docket No. EO-05-01: Exhibit D: Mirant Potomac River Schedule of Unit Operations, part of Supplement Number 3 to the Operating Plan of Mirant Potomac River, LLC

  9. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  10. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  11. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  12. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  13. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: ~17 keV transmission though Mo filters Port 2: IR-visible from large-angle synchrotron radiation; UV-x-ray for beam position monitor (BPM) Endstations Port 1: Hard x-ray to visible converter (phosphor) Port 2: None (available for temporary experiments) Both ports are inside the ALS shielding. Characteristics Port 1: Pinhole-based x-ray system for

  14. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: ~17 keV transmission though Mo filters Port 2: IR-visible from large-angle synchrotron radiation; UV-x-ray for beam position monitor (BPM) Endstations Port 1: Hard x-ray to visible converter (phosphor) Port 2: None (available for temporary experiments) Both ports are inside the ALS shielding. Characteristics Port 1: Pinhole-based x-ray system for

  15. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: ~17 keV transmission though Mo filters Port 2: IR-visible from large-angle synchrotron radiation; UV-x-ray for beam position monitor (BPM) Endstations Port 1: Hard x-ray to visible converter (phosphor) Port 2: None (available for temporary experiments) Both ports are inside the ALS shielding. Characteristics Port 1: Pinhole-based x-ray system for

  16. Beamline 11.0.1

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    materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes...

  17. Beamline 8.3.1

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    BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal,...

  18. Beamline 5.3.1

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    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator...

  19. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator...

  20. Beamline 5.4.1

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    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1...

  1. Beamline 5.4.1

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    5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1...

  2. Beamline 1.4.3

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    Beamline 1.4.3 Beamline 1.4.3 Print Tuesday, 20 October 2009 08:08 FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized

  3. Beamline 10.3.2

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    2 Beamline 10.3.2 Print Tuesday, 20 October 2009 09:15 Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7

  4. Beamline 11.3.1

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    1.3.1 Beamline 11.3.1 Print Tuesday, 20 October 2009 09:22 Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and

  5. Beamline 11.3.1

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    3.1 Beamline 11.3.1 Print Tuesday, 20 October 2009 09:22 Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford

  6. Beamline 4.0.2

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    Beamline 4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported

  7. Beamline 4.0.2

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    Beamline 4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported

  8. Beamline 5.0.1

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    Beamline 5.0.1 Beamline 5.0.1 Print Tuesday, 20 October 2009 08:32 Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving

  9. Beamline 5.0.3

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    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm

  10. Beamline 5.0.3

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    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm

  11. Beamline 5.4.1

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    Beamline 5.4.1 Beamline 5.4.1 Print Wednesday, 16 June 2010 16:03 Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence

  12. Beamline 6.1.2

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    Beamline 6.1.2 Beamline 6.1.2 Print Tuesday, 20 October 2009 08:41 Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE)

  13. Beamline 5.0.2

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    Beamline 5.0.2 Beamline 5.0.2 Print Tuesday, 20 October 2009 08:35 Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with

  14. Beamline 8.2.1

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    1 Beamline 8.2.1 Print Tuesday, 20 October 2009 08:53 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE.

  15. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  16. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  17. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  18. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  19. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  20. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  1. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  2. Beamline 1.4.3

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    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  3. Beamline 1.4.4

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    Beamline 1.4.4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron

  4. Beamline 1.4.4

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    Beamline 1.4.4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron

  5. Beamline 1.4.4

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    Beamline 1.4.4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron

  6. Beamline 11.0.2

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    2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables

  7. Beamline 11.0.2

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    0.2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables

  8. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

  9. Beamline 5.4.1

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    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

  10. Beamline 5.4.1

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    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

  11. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  12. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  13. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  14. Beamline 7.0.2

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    7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  15. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  16. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  17. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  18. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  19. Beamline 7.0.2

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    0.2 Beamline 7.0.2 Print Tuesday, 20 October 2009 08:45 Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system,

  20. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  1. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  2. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  3. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  4. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  5. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  6. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  7. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  8. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  9. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  10. Beamline 10.0.1

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    0.0.1 Beamline 10.0.1 Print Tuesday, 20 October 2009 09:08 Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating

  11. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  12. Beamline 7.0.2

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    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  13. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) NOTE: AS OF MAY 2016, BEAMLINE 8.2.1 IS RESTRICTED TO MULTILAYER MODE UNTIL FURTHER NOTICE. Monochromator Double crystal, Si(111) Measured

  14. Beamline Temperatures

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    Temperatures Energy: 3.0000 GeV Current: 497.0950 mA Date: 16-May-2016 02:53:04 Beamline Temperatures Energy 3.0000 GeV Current 497.1 mA 16-May-2016 02:53:04 LN:MainTankLevel 168.9 in LN:MainTankPress 60.0 psi SPEAR-BL:B120HeFlow 13.4 l/min SPEAR-BL:B131HeFlow 22.7 l/min BL 2 BL02:M0_LCW 31.5 ℃ BL 4-1 BL04-1:BasePlate -13.0 ℃ BL04-1:Bottom1 54.0 ℃ BL04-1:Bottom2 55.0 ℃ BL04-1:Lower 32.0 ℃ BL04-1:Moly 64.0 ℃ BL04-1:ChinGuard1 31.0 ℃ BL04-1:ChinGuard2 31.0 ℃ BL04-1:FirstXtalA

  15. Beamline Vacuum

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    Vacuum Energy: 3.0000 GeV Current: 496.0377 mA Ring Pres.: 5.1e-10 Torr Date: 16-May-2016 02:54:04 Beamline Vacuum Energy 3.0000 GeV Current 496.0 mA Vacuum 5.1e-10 Torr 16-May-2016 02:54:04 BL 1 - Open 04G-IG-BL01 5.2e-10 Torr 01-0 IG2 6.2e-10 Torr BL 2 - Open 05G-IG-BL02 2.6e-10 Torr 02-0 IG2 3.2e-10 Torr 02-0 IG3 3.2e-09 Torr BL 4 - Open BL 4-1 BL 4-2 BL 4-3 17G-IG-BL04 2.1e-09 Torr 04-0 IG2 2.8e-09 Torr 04-0 IG3 3.9e-09 Torr 04-0 IG4 5.4e-09 Torr 04-0 IG5 1.0e-12 Torr 04-1 IG1 2.2e-09 Torr

  16. Beamline 2.1

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    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  17. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  18. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  19. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  20. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  1. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  2. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  3. ALS Beamlines Directory

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    Bend Diagnostic beamline Note: This beamline is NOT open to general users. 1-2 keV W. Byrne (510) 486-7517 This e-mail address is being protected from spambots. You need...

  4. Beamline 10.3.1

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    1 Beamline 10.3.1 Print Tuesday, 20 October 2009 09:14 X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to

  5. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  6. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  7. Beamline 10.3.2

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    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  8. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  9. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  10. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    10.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  11. Beamline 10.3.2

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    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  12. Beamline 10.3.2

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    3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  13. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  14. Beamline 10.3.2

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    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  15. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  16. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  17. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  18. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 11.0.1 Print Tuesday, 20 October 2009 09:16 PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving

  19. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Beamline 11.0.1 Print Tuesday, 20 October 2009 09:16 PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving

  20. Beamline 11.3.1

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    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  1. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  2. Beamline 11.3.1

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    3.1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker

  3. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker

  4. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  5. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  6. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  7. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  8. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 11.3.2 Print Tuesday, 20 October 2009 09:23 Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5

  9. Beamline 12.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Beamline 12.0.1 Print Tuesday, 20 October 2009 09:23 EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation

  10. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Beamline 12.0.2 Print Tuesday, 20 October 2009 09:30 Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving

  11. Beamline 12.2.2

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    2.2.2 Beamline 12.2.2 Print Tuesday, 20 October 2009 09:31 High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused:

  12. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated

  13. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000

  14. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.3.2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000

  15. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  16. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  17. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  18. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the

  19. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  20. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  1. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  2. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0

  3. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0

  4. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator

  5. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator

  6. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Beamline 5.0.2 Print Tuesday, 20 October 2009 08:35 Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad

  7. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  8. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  9. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  10. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  11. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  12. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  13. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  14. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  15. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak

  16. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in

  17. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in

  18. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Beamline 6.0.2 Print Tuesday, 20 October 2009 08:40 Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond

  19. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  20. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  1. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  2. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  3. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm

  4. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm

  5. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 6.3.1 Print Tuesday, 20 October 2009 08:42 Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000

  6. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  7. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  8. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  9. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  10. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  11. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  12. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Beamline 7.3.3 Print Tuesday, 20 October 2009 08:50 Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC

  13. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Beamline 7.3.3 Print Tuesday, 20 October 2009 08:50 Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC

  14. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Beamline 8.0.1 Print Tuesday, 20 October 2009 08:51 Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250

  15. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Beamline 8.0.1 Print Tuesday, 20 October 2009 08:51 Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250

  16. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.2.2 Beamline 8.2.2 Print Tuesday, 20 October 2009 08:54 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot

  17. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 8.2.2 Print Tuesday, 20 October 2009 08:54 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size

  18. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.3.1 Beamline 8.3.1 Print Tuesday, 20 October 2009 08:55 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x

  19. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 8.3.2 Print Tuesday, 20 October 2009 08:56 Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft

  20. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    9.0.1 Beamline 9.0.1 Print Tuesday, 20 October 2009 08:57 Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9

  1. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 9.3.2 Print Tuesday, 20 October 2009 09:06 Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011

  2. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  3. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  4. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS

  5. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Beamline 12.2.2 Print Tuesday, 20 October 2009 09:31 High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90

  6. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated

  7. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  8. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Director's Office Beamline 6.0.1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and

  9. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  10. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 8.2.2 Print Tuesday, 20 October 2009 08:54 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size

  11. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.3.1 Beamline 8.3.1 Print Tuesday, 20 October 2009 08:55 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x

  12. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Beamline 5.3.1 Print Tuesday, 20 October 2009 08:37 Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment

  13. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    11.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  14. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  15. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  16. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    11.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  17. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  18. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  19. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  20. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  1. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  2. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  3. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  4. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission

  5. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  6. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  7. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  8. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  9. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations Ambient-pressure photoemission spectroscopy

  10. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.2.2 Beamline 5.3.2.2 Print Tuesday, 20 October 2009 08:37 Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active

  11. Commissioning of a microprobe-XRF beamline (BL-16) on Indus-2 synchrotron source

    SciTech Connect (OSTI)

    Tiwari, M. K.; Gupta, P.; Sinha, A. K.; Garg, C. K.; Singh, A. K.; Kane, S. R.; Garg, S. R.; Lodha, G. S.

    2012-06-05

    We report commissioning of the microprobe-XRF beamline on Indus-2 synchrotron source. The beamline has been recently made operational and is now open for the user's experiments. The beamline comprises of Si(111) double crystal monochromator and Kirkpatrick-Baez focusing optics. The beamline covers wide photon energy range of 4 - 20 keV using both collimated and micro-focused beam modes. The design details and the first commissioning results obtained using this beamline are presented.

  12. Beamline 29-ID

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    component; implementation of beamline controls and safety systems (cleanroom, FOE progress, FOE progress2) Fall 2012 FDR approval (October 15) Installation of...

  13. Schedule - 88-Inch Cyclotron

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Schedule Cyclotron Schedule

  14. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION...

  15. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE...

  16. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE...

  17. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION...

  18. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  19. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  20. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  1. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  2. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  3. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

  4. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

  5. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

  6. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  7. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  8. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  9. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  10. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  11. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  12. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  13. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  14. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

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    5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

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    5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

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    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  17. Beamline 5.4.1

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    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  18. Beamline 9.0.2

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    9.0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

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    9.0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  1. Beamline 9.0.2

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    9.0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

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    9.0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

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    2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

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    2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  1. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

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    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

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    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  6. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  7. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  8. Beamline 3.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  9. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  10. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  11. Beamline 9.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  12. Beamline 9.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  13. LCLS Operations Schedule January February March April May June July August September October November December

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Operations Schedule January February March April May June July August September October November December 2009 Run 1 Oct. 1-Dec. 17 2010 Run 2 Run 3 May 6 - Sep. 13 Oct. 7 - Dec. 17 2011 Run 3 Run 4 Run 5 Jan. 13 - Mar. 8 Jan. 18 - Oct. 24 Nov.17-Dec.1 2012 Run 5 Run 6 Run 6 Jan. 19 - May 29 May 31 - July 31 Oct. 5 - Dec. 19 2013 Run 7 Run 8 Run 8 Jan. 16 - Jul. 16 Aug. 6 Oct. 17 - Dec. 20 2014 Run 8 Run 9 Run 10 Jan. 16 - Mar. 24 Mar. 26 - Aug. 4 Oct. 15 - Dec. 19 2015 Run 10 Run 11 Run 12

  14. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION...

  15. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION...

  16. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION...

  17. BEAMLINE 13-1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Joins the Magnetic Club February 2007: Five Images for the Price of One: Using X-ray Holography for Simultaneous Imaging SSRL | Beamlines | User Admin | Safety Last Updated: 28 JAN...

  18. Hutch for CSX Beamlines

    ScienceCinema (OSTI)

    Ed Haas

    2013-07-17

    NSLS-II will produce x-rays 10,000 times brighter than NSLS. To keep people safe from intense x-rays in the new facility, special enclosures, called hutches, will surround particular sections of beamlines.

  19. G4beamline

    Energy Science and Technology Software Center (OSTI)

    2011-05-24

    G4beamline is a single-particle-tracking simulation code based on the Geant4 toolkit. It is specifically optimized for the realistic evaluation of beam lines. It is especially useful for evaluating future muon facilities.

  20. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  1. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  2. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  3. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  4. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  5. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  6. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  7. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  8. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  9. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  10. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  11. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  12. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  13. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  14. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  15. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  16. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  17. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  18. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  19. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  20. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  1. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  2. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  3. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  4. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  5. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  6. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  7. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  8. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  9. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  10. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  11. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  12. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  13. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  14. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  15. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  16. Beamline 12.2.2

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    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  17. Beamline 12.2.2

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    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  18. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  19. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  20. Beamline 12.3.2

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    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  1. Beamline 12.3.2

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    3.2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  2. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  3. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  4. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  5. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  6. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  7. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  8. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  9. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  10. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  11. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  12. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  13. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  14. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  15. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  16. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  17. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  18. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  19. Beamline 4.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  20. Beamline 4.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  1. Beamline 4.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  2. Beamline 4.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  3. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  4. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  5. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  6. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  7. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  8. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  9. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  10. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  11. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  12. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  13. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  14. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  15. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  16. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  17. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  18. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  19. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  20. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  1. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  2. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  3. Beamline 6.0.1

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    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  4. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  5. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  6. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond streak camera Spot

  7. Beamline 6.0.2

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    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  8. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  9. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond

  10. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  11. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  12. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  13. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  14. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode.

  15. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  16. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  17. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  18. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  19. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  20. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.3.1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  1. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  2. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  3. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  4. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: ISAAC In Situ XAS GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500 µm Scientific

  5. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  6. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  7. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  8. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300

  9. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300

  10. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300

  11. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300

  12. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300

  13. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  14. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  15. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  16. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  17. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  18. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  19. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  20. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  1. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  2. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  3. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  4. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  5. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  6. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  7. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  8. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  9. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  10. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  11. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  12. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  13. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  14. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  15. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  16. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  17. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  18. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  19. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  20. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  1. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  2. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  3. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  4. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  5. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  6. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  7. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  8. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  9. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  10. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  11. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  12. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  13. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  14. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  15. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  16. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  17. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  18. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  19. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  20. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and