National Library of Energy BETA

Sample records for beamline information operational

  1. Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Micromachining X-ray Lithography Micromachining I (XRLM1), Port 2A, 10 mrad (Updated) X-ray lithography beamline for microfabrication. Two mode of operation, "white" and...

  2. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory ALS Beamlines Directory Print Monday, 31 August 2009 08:16 Beamlines, Parameters, Contact Information, and Schedules Click on the image to see/download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist

  3. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to see/download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling

  4. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to see/download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling

  5. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ALS Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to see/download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling

  6. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamlines Directory Print Beamlines, Parameters, Contact Information, and Schedules Click on the image to see/download a high-resolution version of the ALS beamclock. Beamline Parameters Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational. Individual beamline schedules are posted when available. Please contact the responsible beamline scientist for additional schedule information. When calling from

  7. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: 17 keV transmission though...

  8. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through...

  9. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 3.1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission...

  10. Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    beamline long-term schedules can be found on the ALS Beamlines Directory. Photon Source Parameters Brightness curves for bend magnet, superbend, and insertion devices....

  11. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic,...

  12. Beamlines & Facilities

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Imaging Group: Beamlines The X-ray Micrscopy and Imaging Group operates several beamlines and facilities. The bending magnet beamline (2-BM) entertaines 2 general user programs in...

  13. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline Scientific Applications SAXSWAXS Solution Scattering Fiber diffraction Anomalous SAXS Source characteristics Bending Magnet Port 6A Electron Beam energy 1.3 GeV Dipole...

  14. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    beamline Beamline Every NIF beam starts at the master oscillator. The low-energy beam is amplified in the preamplifier module and then in the power amplifier, the main amplifier, and again in the power amplifier before the beam is run through the switchyard and into the target chamber

  15. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    The GCPCC beamline utilizes 1.5 mrad of the output of a single-pole 7 Tesla super conducting wiggler. The x-rays are collimated vertically by a fixed radius cylindrical mirror, ...

  16. Beamline

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lisa Bovenkamp CAMD SAXS Beamline Schedule Your browser does not appear to support JavaScript, but this page needs to use JavaScript to display correctly. You can visit the...

  17. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational...

  18. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source...

  19. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes...

  20. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  1. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  2. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  3. Beamline 1.4.4

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes...

  4. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes...

  5. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source...

  6. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 -...

  7. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 3.1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is

  8. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational...

  9. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational...

  10. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Endstations: Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm...

  11. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes...

  12. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes...

  13. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics...

  14. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    12.3.1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source...

  15. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes ...

  16. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open...

  17. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Yes, but not open to General Users Source characteristics 3-cm period undulator (U3)...

  18. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV...

  19. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range...

  20. 4-ID beamline layout

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Sector 4 beamline layout Overview Sector 4 uses a canted undulator straight section to operate two beamlines The 4-ID-C beamline operates between 500 and 3000 eV while the 4-ID-D...

  1. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  2. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  3. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  4. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  5. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  6. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  7. Beamline 3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1-2 keV transmission through thin-film carbon filter Endstations Optical diagnostics table with streak camera Characteristics 1:1 focusing of beam image Detectors Back-thinned CCD camera, dual sweep synchroscan streak camera Scientific applications Storage ring diagnostics, accelerator physics Local contact/ Spokesperson This e-mail address is being

  8. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational...

  9. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes...

  10. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal,...

  11. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range...

  12. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, ...

  13. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator...

  14. Beamline 3.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator...

  15. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1...

  16. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1...

  17. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with...

  18. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION...

  19. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION ...

  20. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION ...

  1. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 10.3.2 Print Tuesday, 20 October 2009 09:15 Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7

  2. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Beamline 5.0.1 Print Tuesday, 20 October 2009 08:32 Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving

  3. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.2 Beamline 5.0.2 Print Tuesday, 20 October 2009 08:35 Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with

  4. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm

  5. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode.

  6. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode.

  7. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Beamline 6.1.2 Print Tuesday, 20 October 2009 08:41 Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE)

  8. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Beamline 7.3.1 Print Thursday, 17 June 2010 12:09 Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations

  9. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Director's Office Beamline 6.0.1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as RIX (QERLIN) beamline. Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors

  10. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  11. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  12. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  13. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x

  14. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Beamline 2.1 Print Tuesday, 20 October 2009 08:16 National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate

  15. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: ~17 keV transmission though Mo filters Port 2: IR-visible from large-angle synchrotron radiation; UV-x-ray for beam position monitor (BPM) Endstations Port 1: Hard x-ray to visible converter (phosphor) Port 2: None (available for temporary experiments) Both ports are inside the ALS shielding. Characteristics Port 1: Pinhole-based x-ray system for

  16. Beamline 7.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Diagnostic beamline GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range Port 1: ~17 keV transmission though Mo filters Port 2: IR-visible from large-angle synchrotron radiation; UV-x-ray for beam position monitor (BPM) Endstations Port 1: Hard x-ray to visible converter (phosphor) Port 2: None (available for temporary experiments) Both ports are inside the ALS shielding. Characteristics Port 1: Pinhole-based x-ray system for

  17. Beamline 1.4.4

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    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION...

  18. Beamline 1.4.3

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    Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION...

  19. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION...

  20. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  1. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  2. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  3. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  4. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution,

  5. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables

  6. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Beamline 11.0.2 Print Tuesday, 20 October 2009 09:17 Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables

  7. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.4.1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited

  8. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  9. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  10. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  11. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  12. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  13. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  14. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  15. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  16. Beamline 7.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Surface and Materials Science, Spectromicroscopy Scientific disciplines: Correlated electron system, materials science Endstations: nanoARPES (nARPES) EmicroARPES (Branchline 7.0.2.1) GENERAL BEAMLINE INFORMATION Operational No Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range See endstation tables Monochromator See endstation tables Scientific disciplines Correlated electron system, materials science Website Beamline 7:

  17. XRLM Beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    XRLM 1 Beamline (Port 2A) Operated by: Center for Advanced Microstructures & Devices (CAMD, Louisiana State University), and the Institute for Micromanufacturing (IfM, LaTech University) A. Characteristics: This beamline can operate in two modes - a 'white' light mode without any optics and a 'mirror' light mode. 'White' light mode 'White' spectrum, no optics, 2 Beryllium windows, 1st window, 100 µm thick , 2nd window 120 µm thick transmitted bandpass spectrum: 2.0 keV – 7 keV (10 keV @

  18. Conceptual design of the neutral beamline for TPX long pulse operation

    SciTech Connect (OSTI)

    Wright, K.E.; Dahlgren, F.; Fan, H.M.; Grisham, L.R.; Hammersand, F.G.; Kamperschroer, J.H.; Lontai, L.M.; Oldaker, M.E.; Rogoff, P.

    1993-11-01

    The Tokamak Physics Experiment (TPX) will require a minimum of 8.0 megawatts of Neutral Beam beating power to be injected into the plasma for pulse lengths up to one thousand (1000) seconds to meet the experimental objectives. The Neutral Beam Injection System (NBIS) for initial operation on TPX will consist of one neutral beamline (NBL) with three Ion sources. Provisions will be made for a total of three NBLs. The NBIS will provide S.S MW of 120 keV D{sup 0} and 2.S MW of partial-energy D{sup 0} at 60 keV and 40 keV. The system also provides for measuring the neutral beam power, limits excess cold gas from entering the torus, and provides independent power, control, and protection for each individual ion source and accelerating structure. The Neutral Beam/Torus Connecting Duct (NB/TCD) includes a vacuum valve, an electrical insulating break, alignment bellows, vacuum seals, internal energy absorbing protective elements, beam diagnostics and bakeout capability. The NBL support structure will support the NBL, which will weigh approximately 80 tons at the proper elevation and withstand a seismic event. The NBIS currently operational on the Tokamak Fusion Test Reactor (TFTR) at the Princeton Plasma Physics Laboratory (PPPL) is restricted to injection pulse lengths of two (2) seconds by the limited capability of various energy absorbers. This paper describes the modifications and improvements which will be implemented for the TFTR Neutral Beamlines and the NB/TCD to satisfy the TPX requirements.

  19. Beamline 29-ID

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    & Milestones IEX Advisory Committees FDR Beamline Information RSXS ARPES APS Ring Status Current APS Schedule Intermediate Energy X-Rays (29-ID): The Intermediate Energy...

  20. APS Beamline 6-ID-B,C

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    B,C Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-B,C Beamline 6-ID-B,C is operated by the Magnetic Materials Group in the X-ray...

  1. APS Beamline 6-ID-D

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    D Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-D Beamline 6-ID-D is operated by the Magnetic Materials Group in the X-ray Science...

  2. APS Beamline 6-ID-D

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    MM-Group Home MMG Advisory Committees 6-ID-D Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-D Beamline 6-ID-D is operated by the...

  3. APS Beamline 6-ID-B,C

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6-ID-B,C Home Recent Publications Beamline Info Optics Instrumentation Software User Info Beamline 6-ID-B,C Beamline 6-ID-B,C is operated by the Magnetic Materials Group in the...

  4. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION...

  5. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.2.2 Beamline 5.3.2.2 Print Tuesday, 20 October 2009 08:37 Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active

  6. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.2.2 Beamline 5.3.2.2 Print Tuesday, 20 October 2009 08:37 Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active

  7. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  8. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  9. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  10. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  11. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    10.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  12. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE)

  13. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  14. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  15. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  16. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  17. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  18. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 11.0.1 Print Tuesday, 20 October 2009 09:16 PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving

  19. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 11.0.1 Print Tuesday, 20 October 2009 09:16 PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving

  20. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 11.3.1 Print Tuesday, 20 October 2009 09:22 Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream

  1. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Beamline 11.3.2 Print Tuesday, 20 October 2009 09:23 Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5

  2. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated

  3. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.3.2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000

  4. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  5. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  6. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x

  7. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the

  8. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  9. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  10. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  11. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA)

  12. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4.0.3 Beamline 4.0.3 Print Tuesday, 20 October 2009 08:30 High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator

  13. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0

  14. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator

  15. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.0.2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator

  16. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Beamline 5.0.2 Print Tuesday, 20 October 2009 08:35 Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad

  17. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  18. Beamline 5.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  19. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  20. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  1. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  2. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.3.1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques

  3. Beamline 5.4.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.4.1 Beamline 5.4.1 Print Wednesday, 16 June 2010 16:03 Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics

  4. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 5.4.3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer,

  5. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as RIX (QERLIN) beamline. Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond

  6. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as RIX (QERLIN) beamline. Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond

  7. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as RIX (QERLIN) beamline. Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond

  8. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as RIX (QERLIN) beamline. Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond

  9. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as RIX (QERLIN) beamline. Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond

  10. Beamline 6.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as RIX (QERLIN) beamline. Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond

  11. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  12. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  13. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    6.0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  14. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  15. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  16. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  17. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  18. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  19. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  20. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  1. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  2. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at

  3. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at

  4. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at

  5. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at

  6. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at

  7. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.3.2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at

  8. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  9. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  10. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  11. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  12. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  13. Beamline 7.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  14. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Beamline 7.3.3 Print Tuesday, 20 October 2009 08:50 Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC

  15. Beamline 7.3.3

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    3.3 Beamline 7.3.3 Print Tuesday, 20 October 2009 08:50 Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC

  16. Beamline 8.0.1

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    0.1 Beamline 8.0.1 Print Tuesday, 20 October 2009 08:51 Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250

  17. Beamline 8.2.2

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    2 Beamline 8.2.2 Print Tuesday, 20 October 2009 08:54 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size

  18. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Beamline 8.3.2 Print Tuesday, 20 October 2009 08:56 Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft

  19. Beamline 9.3.1

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    3.1 Beamline 9.3.1 Print Tuesday, 20 October 2009 09:03 Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm

  20. Beamline 10.3.2

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    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  1. Beamline 10.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Environmental and Materials Science, Micro X-Ray Absorption Spectroscopy (µXAS, µEXAFS) Scientific disciplines: Earth and environmental science, material science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet (beamline optics collect 0.166 horizontal mrad) Energy range 2.5-17 keV Monochromator Monochromatic, with Si(111) two-crystal, constant-exit monochromator Measured flux 9 x 109 photons/s into 16 x 7 µm2 spot at 6 keV Resolving power (E/ΔE) 7000

  2. Beamline 12.3.1

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    1 Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated

  3. Beamline 12.3.2

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    2 Beamline 12.3.2 Print Tuesday, 20 October 2009 09:34 Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors

  4. Beamline 5.0.3

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    0.3 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Proposal cycle Proposals for Structural Biology Beamlines (2-month cycle) Source characteristics 11.4-cm-period wiggler (W11) Energy range 12,700 eV(fixed) Monochromator Asymmetric cut single crystal Si(220) Measured flux 2.4 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole

  5. Beamline 5.4.3

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    5.4.3 Beamline 5.4.3 Print Wednesday, 16 June 2010 16:10 High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury

  6. Beamline 6.0.1

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    1 Print Ultrafast / Femtosecond Dynamics Hard X Ray GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as RIX (QERLIN) beamline. Source characteristics 3-cm period undulator (U3) Energy range 2.3-9 keV Monochromator Double crystal, Si(111) and Ge(111) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times smaller in femtosecond mode. Laser runs at 2-4 KHz. Resolving power (E/ΔE) ~1/6000 - 1/1000 Detectors Photodiode and picosecond

  7. Beamline 6.0.2

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    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  8. Beamline 6.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Ultrafast/Femtosecond Dynamics Soft X Ray Scientific disciplines: Chemical dynamics, materials science, surfaces, interfaces GENERAL BEAMLINE INFORMATION Operational Decommissioned. To reopen as energy science (AMBER) beamline. Source characteristics 3.5-cm period undulator (U3) Energy range 250 eV- 1.5 keV Monochromator White light and VLS-PGM, with two gratings (250 and 1000 lines/mm) Calculated fs flux (1.9 GeV, 400 mA) 10,000-100,000 photons/pulse in picosecond mode. 10,000 times

  9. Beamline 7.3.1

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    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  10. Beamline 7.3.1

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    7.3.1 Print Photoemission electron microscope PEEM2 Scientific disciplines: Magnetism, materials, surface science, polymers Note: This beamline is NOT open to general users. GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 180-1500 eV Monochromator SGM Calculated flux (1.9 GeV, 400 mA) 3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized) Resolving power (E/ΔE) 1,000 Endstations Photoemission electron microscope (PEEM2)

  11. Beamline 8.2.1

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    1 Beamline 8.2.1 Print Tuesday, 20 October 2009 08:53 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec

  12. Beamline 8.2.2

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    2 Beamline 8.2.2 Print Tuesday, 20 October 2009 08:54 Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size

  13. Beamline 5.3.1

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    Beamline 5.3.1 Beamline 5.3.1 Print Tuesday, 20 October 2009 08:37 Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment

  14. Beamline 2.1

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    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  15. Beamline 2.1

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    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  16. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  17. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  18. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  19. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  20. Beamline 2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print National Center for X-Ray Tomography (NCXT) Scientific discipline: Biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 400 - 1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 2048 x 2048 pixels Resolving power (E/ĢE) 500-700 Endstations X-ray microscope (XM-2) Characteristics Full-field soft x-ray transmission microscope Spatial resolution Zone-plate dependent Detectors Back-thinned 2048- x 2048-pixel

  1. Beamlines | Advanced Photon Source

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    Beamlines Beamlines Home Beamlines Directory Research Techniques Sectors Directory Status and Schedule Safety and Training Beamlines The Advanced Photon Source consists of 34...

  2. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.2 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations Nicolet Magna 760 FTIR, Nic-Plan IR Microscope (N2 purged) Characteristics Motorized sample stage, 0.1-micron resolution, reflection,

  3. Beamline 10.0.1

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    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  4. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  5. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  6. Beamline 10.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  7. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    11.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  8. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  9. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  10. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    11.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  11. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  12. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  13. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  14. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  15. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  16. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  17. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.0.2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations

  18. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  19. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  20. Beamline 11.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  1. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  2. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  3. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  4. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  5. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  6. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  7. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  8. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  9. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  12. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  13. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  14. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  15. Beamline 5.4.1

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    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  16. Beamline 5.4.1

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    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  17. Beamline 5.4.1

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    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  18. Beamline 9.0.2

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    9.0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  19. Beamline 9.0.2

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  20. Beamline 9.0.2

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  1. Beamline 9.0.2

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  2. Beamline 9.0.2

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  3. Beamline 9.0.2

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  4. Beamline 9.0.2

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  5. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  6. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  7. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  8. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  9. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  10. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  11. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  12. Beamline 9.3.2

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    3.2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  13. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  14. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  15. Beamline 1.4.4

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    4 Print Infrared spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 0.05-1.5 eV Frequency range 800 - 10,000 cm-1 Interferometer resolution up to 0.125 cm-1 Endstations Thermo Nicolet Nexus 870 FTIR, Continuum XL IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution;

  16. Beamline 10.0.1

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    0.1 Print Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids Scientific disciplines: Strongly correlated electron systems, magnetism Endstations: High energy resolution spectrometer (HERS) Spin- and angle-resolved photoelectron spectroscopy (Spin-ARPES) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (first and third harmonics) Energy range 17-350 eV Monochromator Spherical grating monochromator (380, 925, 2100 lines/mm gratings)

  17. Beamline 11.0.2

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    2 Print Molecular Environmental Science (MES) Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences Endstations: 11.0.2.1: Ambient-pressure x-ray photoemission spectroscopy (APXPS) 11.0.2.2: Scanning transmission x-ray microscope (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range See endstation tables Monochromator See endstation tables Endstations 11.0.2.1:

  18. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  19. Beamline 12.0.1

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    2.0.1 Print EUV optics testing and interferometry, angle- and spin-resolved photoemission Scientific discipline: Applied science, correlated electron systems Endstations: Angle- and spin-resolved photoemission (12.0.1.1) Berkeley Dose Calibration Tool (DCT)(12.0.1.2) SEMATECH Berkeley Microfield Exposure Tool (MET) (12.0.1.3) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 8-cm-period undulator (U8) Energy range See endstation tables Monochromator See endstation tables

  20. Beamline 12.3.1

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    1 Print Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5-17 keV (1% max flux) Frequency range 2.5-0.73 Angstrom wavelength Beam size 100 µm round beam default 10 µm and 30 µm collimators available for small samples with flux reduced to 1% and 12%, respectively. 120 µm x 120 µm Gaussian uncollimated beam shape at sample. Scientific discipline

  1. Beamline 3.3.2

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    3.3.2 Print General x-ray testing station GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 4-20 keV Monochromator Si(111) Endstations Hutch with 2 x 3 ft optical table Calculated spot size at sample Up to 30 x 10 mm Sample format Mount off optical table Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Semiconductor characterization Spokesperson This e-mail address is being protected

  2. Beamline 5.4.1

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    1 Print Infrared spectromicroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.05-1.00 eV Frequency range 650 - 10,000 cm-1 Interferometer resolution Up to 0.125 cm-1 Endstations FTIR bench and IR microscope (N2 purged) Characteristics Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics Spatial resolution Diffraction limited (~wavelength)

  3. Beamline 9.0.2

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  4. Beamline 9.0.2

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    0.2 Print Chemical Dynamics Scientific disciplines: Chemical dynamics, aerosol chemistry, imaging mass spectrometry, chemical kinetics, laser ablation and clusters, combustion and flames. Endstations: Molecular-beam photoelectron/photoion imaging and spectroscopy Flame chamber Ablation chamber Aerosol chamber Kinetics chamber GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 10-cm period undulator (U10) (fundamental) Energy range 7.4-30 eV Undulator beam White beam (straight

  5. Beamline 9.3.2

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    2 Print Chemical and Materials Scientific disciplines: Surfaces, interfaces, catalysis, environmental science, material science, electrochemistry Endstations: Ambient pressure X-ray Photoelectron Spectroscopy (APXPS)* Ambient pressure photoemission GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 30-850 eV Monochromator SGM (gratings: 100, 600 lines/mm) Calculated flux (1.9 GeV, 400 mA) up to 1.5 x 1011 photons/sec, energy dependent Resolving power

  6. APS User Operations

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    Schedules APS Schedule Useful Links Beamline Design Library (former Design Exchange) Machine Status Link Bunch Clock Information APS Systems Status Storage Ring Operating Status...

  7. Beamline 8.2.2

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    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION...

  8. Beamline 12.2.2

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    development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION ... High pressure laser heating Experimental techniques Powder diffraction, high-pressure ...

  9. Beamline 8.3.2

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    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION...

  10. Beamline 5.3.2.1

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    Beamline 5.3.2.1 Print Scanning Transmission X-Ray Microscopy (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 600-2000eV eV Monochromator Low-dispersion, spherical-grating monochromator, two gratings Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25-100

  11. Beamline 5.3.2.1

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    5.3.2.1 Beamline 5.3.2.1 Print Thursday, 26 February 2015 12:20 Scanning Transmission X-Ray Microscopy (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 600-2000eV eV Monochromator Low-dispersion, spherical-grating monochromator, two gratings Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal

  12. Beamline 5.3.2.2

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    Beamline 5.3.2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample

  13. Beamline 5.3.2.2

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    Beamline 5.3.2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample

  14. Beamline 5.3.2.2

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    Beamline 5.3.2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample

  15. Beamline 5.3.2.2

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    Beamline 5.3.2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample

  16. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2.2 Beamline 5.3.2.2 Print Tuesday, 20 October 2009 08:37 Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized

  17. Beamline 10.3.1

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    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  18. Beamline 10.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  19. Beamline 11.0.1

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    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  20. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  1. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  2. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  3. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  4. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  5. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  6. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  7. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS APEXII CCD Spot size at

  8. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS APEXII CCD Spot size at

  9. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS APEXII CCD Spot size

  10. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS APEXII CCD Spot size at

  11. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS APEXII CCD Spot size at

  12. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS APEXII CCD Spot size at

  13. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS APEXII CCD Spot size at

  14. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  15. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  16. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  17. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  18. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  19. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  20. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  1. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  2. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  3. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  4. Beamline 12.0.2

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    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  5. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  6. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  7. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  8. Beamline 12.2.2

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    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  9. Beamline 12.2.2

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    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  10. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  11. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  12. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  13. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  14. Beamline 12.3.2

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    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  15. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  16. Beamline 12.3.2

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    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  17. Beamline 12.3.2

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    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  18. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  19. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  20. Beamline 3.2.1

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    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  1. Beamline 3.2.1

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    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  2. Beamline 3.2.1

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    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  3. Beamline 3.2.1

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    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  4. Beamline 4.0.2

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    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  5. Beamline 4.0.2

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    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  6. Beamline 4.0.3

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    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  7. Beamline 4.0.3

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    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  8. Beamline 4.0.3

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    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  9. Beamline 4.0.3

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    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  10. Beamline 4.2.2

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    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  11. Beamline 4.2.2

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    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  12. Beamline 4.2.2

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    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  13. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  14. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  15. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  16. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  17. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  18. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  19. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  20. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  1. Beamline 5.3.1

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    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  2. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  3. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  4. Beamline 5.4.3

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    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  5. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  6. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  7. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  8. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  9. Beamline 6.1.2

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    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  10. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  11. Beamline 6.3.1

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    1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500

  12. Beamline 6.3.1

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    1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500

  13. Beamline 6.3.1

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    1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500

  14. Beamline 6.3.2

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    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  15. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  16. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  17. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  18. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  19. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  20. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  1. Beamline 7.3.3

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    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  2. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  3. Beamline 7.3.3

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    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  4. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  5. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  6. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  7. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  8. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  9. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  10. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    7.3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm

  11. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  12. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  13. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  14. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  15. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  16. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  17. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  18. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  19. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  20. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  1. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8.0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380,

  2. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  3. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  4. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  5. Beamline 8.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max

  6. Beamline 8.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max

  7. Beamline 8.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max

  8. Beamline 8.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max

  9. Beamline 8.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max

  10. Beamline 8.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max

  11. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  12. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  13. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  14. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  15. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  16. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  17. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  18. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  19. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  20. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  1. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  2. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  3. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  4. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  5. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  6. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  7. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    9.0.1 Print Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9 GeV, 400 mA) 2.8 x 1015 photons/s/1%BW/central

  8. Beamline 9.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Diffraction Microscopy Scientific disciplines: Applied science, biology, polymers, soft materials. Endstations: Serial crystallography Diffractive imaging Nanosurveyor GENERAL BEAMLINE INFORMATION Operational Yes. Source characteristics 10-cm period undulator (U10) Energy range 500-1500 eV Monochromator Either none or an off-axis zone-plate monochromator that will provide a focused beam with bandwidth of about 0.1% Calculated flux (1.9 GeV, 400 mA) 2.8 x 1015 photons/s/1%BW/central cone

  9. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  10. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  11. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  12. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  13. Beamline 10.3.1

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    1 Print X-ray fluorescence microprobe Scientific disciplines: Environmental science, detector development, low-dose radiation effects in cells GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-20 keV Monochromator White light, multilayer mirrors in Kirkpatrick-Baez configuration Calculated flux (1.9 GeV, 400 mA) 3 x 1010 photons/s at 12.5 keV Resolving power (E/ΔE) White light to 30 at 12 keV Endstations Large hutch with

  14. Beamline 11.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print PEEM3, Soft X-Ray Scattering Scientific disciplines: Magnetism, materials, surface science, polymers Endstations: 11.0.1.1: Photoemission Electron Microscope (PEEM3) 11.0.1.2: Soft X-Ray Scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 150-2000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV Resolving power (E/ΔE) 4,000 at 800 eV Endstations

  15. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 6-17 keV Monochromator Channel-cut Si(111) Flux (1.9 GeV, 400 mA) 1x1011 photons/s/0.01%BW at 10 keV Resolving power (E/ΔE) 1000 Endstations Medium sized hutch with Bruker AXS D8 diffractometer and Oxford Cryosystems Cryostream Plus Detectors Bruker AXS APEXII CCD Spot size at

  16. Beamline 11.3.2

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    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  17. Beamline 11.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.3.2 Print Inspection of EUV lithography masks GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 50-1000 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) 7000 Endstations The SEMATECH Berkeley Actinic Inspection Tool Detector 2048 x 2048 EUV CCD Characteristics 900-1000x zoneplate microscope Spot size at sample 1-5 microns Spatial resolution 60 nm Sample format

  18. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  19. Beamline 12.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Coherent science Scientific disciplines: Applied science, magnetism, materials science Endstations: 12.0.2.1: Coherent optics 12.0.2.2: Coherent x-ray scattering GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Third harmonic of 8-cm-period undulator (U8) Energy range 300-1500 eV Monochromator VLS-PGM, with two gratings (600 and 1200 lines/mm) Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 500 eV Resolving power (E/DE) 1,000 Beam size Focused: 70 x 10 µm

  20. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet, 1.9GeV, 5.29Tesla, 500mA Monochromator Si(111) or Multilayer Energy range 6-40 keV for Si(111), 14-28 keV for Multilayer Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100 Beam size (HxV) Focused: 10 x 10 micron Unfocused: 90 x 100 micron Scientific applications

  1. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  2. Beamline 12.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Microdiffraction Scientific disciplines: Materials, earth and environmental sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Superbend magnet Energy range 6-22 keV Frequency range 2.1-0.56 Ångström wavelength Monochromator White light and monochromatic [four-bounce Si(111)] Calculated flux (1.9 GeV, 400 mA) Typically 8.5 keV: 1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot) Resolving power (E/ΔE) 7000 Detectors Dectris Pilatus 1M Pixel detector, Silicon

  3. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  4. Beamline 3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.1 Print Commercial deep-etch x-ray lithography (LIGA) GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 3-12 keV Monochromator None Endstations Hutch with automated scanner Calculated spot size at sample 100 x 10 mm Sample format 3- and 4-in. wafer format; x-ray mask and LIGA substrate Sample environment Ambient, air Scientific disciplines Applied science Scientific applications Deep-etch x-ray lithography (LIGA) Spokesperson

  5. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  6. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole electromagnet Scattering Chamber 9T magnet GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5.0-cm period elliptical polarization undulator (EPU5) Energy range 100-2000 eV Monochromator Variable-included-angle PGM Calculated flux (1.9 GeV, 400 mA) 1 x 1013 photons/s/0.1%BW at 800 eV [Value reported is the merit function, flux = total flux x (degree of

  7. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  8. Beamline 4.0.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High-resolution spectroscopy of complex materials (MERLIN) Endstations: 4.0.3.1: High-resolution inelastic scattering (MERIXS) 4.0.3.2: Angle-resolved photoemission spectroscopy (ARPES) GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics 9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9) Energy range 9eV-120eV with current gratings Monochromator Variable-included-angle spherical grating monochromator (SGM) Calculated flux (1.9 GeV, 400 mA) 1012

  9. Beamline 4.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4.2.2 Print Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend Energy range 5,500-16,000eV Monochromator Rosenbaum-Rock Si(111) sagitally focused monochromator Calculated flux (1.9 GeV, 400 mA) 2.5 x 1011 photons/s at 12 keV Resolving power (E/ΔE) 7,000 with Si(111) crystals Endstations Minihutch Detectors

  10. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  11. Beamline 5.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Berkeley Center for Structural Biology (BCSB) Monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm-period wiggler (W11) Energy range 12.7 keV (fixed) Monochromator Si(220) Asymmetric cut single crystal Measured flux 1.50 x 1011 photons/s at 400-mA ring current, with 1.5-mrad divergence and 100-µm pinhole collimator Resolving power (E/ΔE) ~10,000 Divergence at sample 3.0 (h) x 0.4 (v)

  12. Beamline 5.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 11.4-cm period wiggler (W11) Energy range 5-16 keV Monochromator Double-crystal, Si(111) liquid N2 cooled Measured flux at 12.4 keV 8.0 x 1011 photons/s at 400-mA ring current, with 1.5-mrad convergence and 100-µm pinhole collimator Resolving

  13. Beamline 5.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Femtosecond Phenomena GENERAL BEAMLINE INFORMATION Operational Yes, but not open to users Source characteristics Bend magnet Energy range 1,000 - 13,000 eV Monochromator Si(111) double crystal, W/B4C ML Flux (1.9 GeV, 400 mA) ~1 x 1012 photons/s/3x10-4BW Resolving power (E/ΔE) 1,200 at 5,000 eV Spot size at sample 100 x 300 µm Endstations Detector testing, KB optics development Sample format Crystals, foils Sample environment 10-6 Torr vacuum or air Experimental techniques X-ray optics

  14. Beamline 5.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print High resolution far-IR to mid-IR spectroscopy GENERAL BEAMLINE INFORMATION Operational 2011 Source characteristics Bend magnet Energy range 0.002-1.0 eV Frequency range 20-10,000 cm-1 Interferometer resolution 0.00096 cm-1 Endstations Bruker IFS 125HR with 9 scanner chambers Characteristics High resolution Far-IR to Mid-IR spectroscopy primarily for gas phase and cluster samples. Spatial resolution ~1 mm Detectors Wide-range MCT-A (mercury cadmium telluride), Si Bolometer, DLATGS, hot

  15. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  16. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1.2 Print Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics, environmental science, materials science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 500-1300 eV Monochromator Zone-plate linear Measured flux (1.9 GeV, 400 mA) Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW Resolving power (E/ΔE) 500-700 Endstations X-ray microscope (XM-1)

  17. Beamline 6.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Magnetic Spectroscopy, Materials Science Scientific disciplines: Magnetic materials research, materials science Endstations: 6.3.1.1: Magnetic Spectroscopy 6.3.1.2: Materials Science GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 250-2000 eV Monochromator VLS-PGM monochromator with fixed exit slit and refocusing mirror Calculated flux (1.9 GeV, 400 mA) 1011photons/s/0.1%BW at 1000 eV Resolving power (E/ΔE) 5,000 Spot size at sample 50 x 500

  18. Beamline 6.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print EUV Calibrations Scientific discipline: Applied sciences GENERAL BEAMLINE INFORMATION Operational Now Source characteristics Bend magnet Energy range 25-1300 eV Monochromator VLS-PGM Calculated flux (1.9 GeV, 400 mA) 1011 photons/s/0.01%BW at 100 eV Resolving power (E/ΔE) <7,000 Endstations Reflectometer Characteristics 2-circle goniometer with x, y, z, q movement of sample Spatial resolution Can position to 10 µm, 0.01° Detectors Photodiode, channeltron Spot size at sample 300 µm

  19. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  20. Beamline 7.3.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.3 Print Small- and Wide-Angle X-Ray Scattering (SAXS/WAXS/Protein SAXS)* Scientific disciplines: Polymer science, materials science, proteins, surface science GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 10 keV Monochromator Mo/B4C double multilayer monochromator Measured flux (1.9 GeV, 400 mA) 1012 photons/s Resolving power (E/ΔE) 100 Detectors Pilatus 1M, Pilatus 100K, Pilatus 300KW, 2x ADSC Quantum 4u Spot size at sample 1 mm x 0.8 mm Samples

  1. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  2. Beamline 8.0.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    0.1 Print Surface and materials science, iRIXS (previously SXF), open port Scientific disciplines: Green energy sciences, material sciences, nanosciences, surfaces sciences, correlated electron system Endstations: 8.0.1.1: iRIXS (previously SXF) 8.0.1.2: Open port 8.0.1.3: Wet-RIXS 8.0.1.5: Bio-NEXAFS GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics 5-cm period undulator (U5) (first, third, and fifth harmonics) Energy range 80-1250 eV Monochromator SGM (gratings: 150, 380, 925

  3. Beamline 8.2.1

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    1 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 T, single pole) Energy range 5-16 keV (standard monochromator); 10-13 keV (multilayer) Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max

  4. Beamline 8.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Berkeley Center for Structural Biology (BCSB) Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend (5.0 T, single pole) Energy range 5-16 keV Monochromator Double crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 3.0 x 1011 photons/sec Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0(h) x 0.5(v) mrad Measured spot size at sample (FWHM) 100 µm Endstations Minihutch

  5. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  6. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (5.0 tesla, single pole) Energy range 5-17 keV (1% max flux) Monochromator Double flat crystal, Si(111) Measured flux (1.9 GeV, 400 mA) 2.5 x 1011 at 11 keV Resolving power (E/ΔE) 7,000 Divergence (max at sample) 3.0 (h) x 0.35 (v) mrad Endstations Minihutch Detectors 3 x 3

  7. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  8. Beamline 8.3.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2 Print Tomography Scientific disciplines: Applied science, biology, earth sciences, energy, environmental sciences, geology, cosmological chemistry GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Superbend magnet (1.9 GeV, 4.37 tesla) Energy range 6-46 keV ML mode Monochromator None or two ML or two Si(111) Flux (1.9 GeV, 500 mA) ~105hv/sec/µm2 in ML mode Resolving power (E/ΔE) White beam/ 1% / 0.02% Endstation 12 x 3 ft optical table in hutch for radiography and

  9. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  10. Beamline 9.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Atomic, molecular, and materials science Endstations: X-ray absorption endstation Polarized-x-ray emission spectrometer GENERAL BEAMLINE INFORMATION Operational Yes. Not open to general users (03-2015) Source characteristics Bend magnet Energy range 2.3-5.2 KeV Monochromator Double Si(111) crystal Measured flux (1.9 GeV, 300 mA) 1011 photons/s Resolving power (E/ΔE) 3000-7200 Beam size Adjustable with 2nd mirror Focused: 1.0 mm x 0.7 mm (~0.5 mm square at 2800 eV) Unfocused: 10 mm x 10

  11. Beamline Vacuum

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    Vacuum Energy: 3.0000 GeV Current: 494.8585 mA Ring Pres.: 1.1e-09 Torr Date: 09-Jan-2016 04:19:08 Beamline Vacuum Energy 3.0000 GeV Current 494.9 mA Vacuum 1.1e-09 Torr...

  12. Beamline Temperatures

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    Temperatures Energy: 3.0000 GeV Current: 495.5347 mA Date: 09-Jan-2016 04:18:38 Beamline Temperatures Energy 3.0000 GeV Current 495.5 mA 09-Jan-2016 04:18:38 LN:MainTankLevel 112.0...

  13. Beamlines Directory | Advanced Photon Source

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    Beamlines: Find a Beamline Beamlines Directory Research Techniques Sectors Directory Status and Schedule Safety and Training back to Beamlines Directory 120213...

  14. Instrumentation upgrades for the Macromolecular Crystallography beamlines

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    of the Swiss Light Source | Stanford Synchrotron Radiation Lightsource Instrumentation upgrades for the Macromolecular Crystallography beamlines of the Swiss Light Source Monday, October 29, 2012 - 2:00am SSRL, Bldg. 137, Rm. 322 Martin Fuchs, MX Group, Swiss Light Source; Paul Scherrer Institute (Villigen, Switzerland) A new unified diffractometer - the D3 - has been developed for the three MX beamlines. The first of the instruments is in general user operation at beamline X10SA since April

  15. ALS Beamlines Directory

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    Bend Diagnostic beamline Note: This beamline is NOT open to general users. 1-2 keV W. Byrne (510) 486-7517 This e-mail address is being protected from spambots. You need...

  16. Beamline 5.3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.3.2.1 Print Scanning Transmission X-Ray Microscopy (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 600-2000eV eV Monochromator Low-dispersion, spherical-grating monochromator, two gratings Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25-100 nm

  17. Beamline 5.3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.3.2.1 Print Scanning Transmission X-Ray Microscopy (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 600-2000eV eV Monochromator Low-dispersion, spherical-grating monochromator, two gratings Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25-100 nm

  18. Beamline 5.3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.3.2.1 Print Scanning Transmission X-Ray Microscopy (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 600-2000eV eV Monochromator Low-dispersion, spherical-grating monochromator, two gratings Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25-100 nm

  19. Beamline 5.3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.3.2.1 Print Scanning Transmission X-Ray Microscopy (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 600-2000eV eV Monochromator Low-dispersion, spherical-grating monochromator, two gratings Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25-100 nm

  20. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25 nm

  1. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25 nm

  2. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.3.2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25

  3. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.3.2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25

  4. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25 nm

  5. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25 nm

  6. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25 nm

  7. Beamline 5.3.2.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    5.3.2.1 Print Scanning Transmission X-Ray Microscopy (STXM) GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 600-2000eV eV Monochromator Low-dispersion, spherical-grating monochromator, two gratings Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25-100 nm

  8. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25 nm

  9. Beamline 5.3.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    2.2 Print Polymer Scanning Transmission X-Ray Microscopy (STXM) @ 5.3.2.2 GENERAL BEAMLINE INFORMATION Operational Yes Source characteristics Bend magnet Energy range 250-780 eV Monochromator Low-dispersion, spherical-grating monochromator, one grating Calculated flux (1.9 GeV, 500 mA) 1 x 107 photons/s at sample Resolving power (E/ΔE) ≤ 5,000 Endstations Scanning transmission x-ray microscope (STXM) Characteristics Active servo-stabilized toroidal premirror Spot size at sample (FWHM) 25 nm

  10. Commissioning of a microprobe-XRF beamline (BL-16) on Indus-2 synchrotron source

    SciTech Connect (OSTI)

    Tiwari, M. K.; Gupta, P.; Sinha, A. K.; Garg, C. K.; Singh, A. K.; Kane, S. R.; Garg, S. R.; Lodha, G. S.

    2012-06-05

    We report commissioning of the microprobe-XRF beamline on Indus-2 synchrotron source. The beamline has been recently made operational and is now open for the user's experiments. The beamline comprises of Si(111) double crystal monochromator and Kirkpatrick-Baez focusing optics. The beamline covers wide photon energy range of 4 - 20 keV using both collimated and micro-focused beam modes. The design details and the first commissioning results obtained using this beamline are presented.

  11. Beamline 29-ID

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    component; implementation of beamline controls and safety systems (cleanroom, FOE progress, FOE progress2) Fall 2012 FDR approval (October 15) Installation of...

  12. Reactor operation safety information document

    SciTech Connect (OSTI)

    Not Available

    1990-01-01

    The report contains a reactor facility description which includes K, P, and L reactor sites, structures, operating systems, engineered safety systems, support systems, and process and effluent monitoring systems; an accident analysis section which includes cooling system anomalies, radioactive materials releases, and anticipated transients without scram; a summary of onsite doses from design basis accidents; severe accident analysis (reactor core disruption); a description of operating contractor organization and emergency planning; and a summary of reactor safety evolution. (MB)

  13. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Beamline 1.4.3 Print Tuesday, 20 October 2009 08:08 FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science,...

  14. Beamline 12.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 12.3.1 Print Tuesday, 20 October 2009 09:33 Structurally Integrated Biology for Life Sciences (SIBYLS) Scientific discipline: Structural biology GENERAL BEAMLINE...

  15. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE...

  16. Beamline 11.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3.1 Print Small-molecule crystallography Beamline 11.3.1 web site Scientific disciplines: Structural chemistry, magnetic materials, microporous materials. GENERAL BEAMLINE...

  17. Occurrence Reporting and Processing of Operations Information

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1995-09-25

    This Manual provides detailed requirements to supplement DOE O 232.1, Occurrence Reporting and Processing of Operations Information. Chg 1 dated 8-12-96.

  18. Reactor operation environmental information document

    SciTech Connect (OSTI)

    Haselow, J.S.; Price, V.; Stephenson, D.E.; Bledsoe, H.W.; Looney, B.B.

    1989-12-01

    The Savannah River Site (SRS) produces nuclear materials, primarily plutonium and tritium, to meet the requirements of the Department of Defense. These products have been formed in nuclear reactors that were built during 1950--1955 at the SRS. K, L, and P reactors are three of five reactors that have been used in the past to produce the nuclear materials. All three of these reactors discontinued operation in 1988. Currently, intense efforts are being extended to prepare these three reactors for restart in a manner that protects human health and the environment. To document that restarting the reactors will have minimal impacts to human health and the environment, a three-volume Reactor Operations Environmental Impact Document has been prepared. The document focuses on the impacts of restarting the K, L, and P reactors on both the SRS and surrounding areas. This volume discusses the geology, seismology, and subsurface hydrology. 195 refs., 101 figs., 16 tabs.

  19. Occurrence Reporting and Processing of Operations Information

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1996-08-12

    To establish and maintain a system for reporting operations information related to DOE-owned or -operated facilities and processing that information to identify the root causes of Unusual, Off -Normal, and Emergency Occurrences and provide for appropriate corrective action. Chg 2, 8-12-96

  20. Occurrence Reporting and Processing of Operations Information

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1995-09-25

    To establish and maintain a system for reporting operations information related to DOE-owned or -operated facilities and processing that information to identify the root causes of Unusual, Off -Normal, and Emergency Occurrences and provide for appropriate corrective action. Chg 1, 10-26-95. Canceled by DOE O 231.1B

  1. Reactor operation environmental information document

    SciTech Connect (OSTI)

    Wike, L.D.; Specht, W.L.; Mackey, H.E.; Paller, M.H.; Wilde, E.W.; Dicks, A.S.

    1989-12-01

    The Savannah River Site (SRS) is a large United States Department of Energy installation on the upper Atlantic Coastal Plain of South Carolina. The SRS contains diverse habitats, flora, and fauna. Habitats include upland terrestrial areas, varied wetlands including Carolina Bays, the Savannah River swamp system, and impoundment related and riparian wetlands, and the aquatic habitats of several stream systems, two large cooling reservoirs, and the Savannah River. These diverse habitats support a large variety of plants and animals including many commercially or recreational valuable species and several rare, threatened or endangered species. This volume describes the major habitats and their biota found on the SRS, and discuss the impacts of continued operation of the K, L, and P production reactors.

  2. Occurrence reporting and processing of operations information

    SciTech Connect (OSTI)

    1997-07-21

    DOE O 232.1A, Occurrence Reporting and Processing of Operations Information, and 10 CFR 830.350, Occurrence Reporting and Processing of Operations Information (when it becomes effective), along with this manual, set forth occurrence reporting requirements for Department of Energy (DOE) Departmental Elements and contractors responsible for the management and operation of DOE-owned and -leased facilities. These requirements include categorization of occurrences related to safety, security, environment, health, or operations (``Reportable Occurrences``); DOE notification of these occurrences; and the development and submission of documented follow-up reports. This Manual provides detailed information for categorizing and reporting occurrences at DOE facilities. Information gathered by the Occurrence Reporting and processing System is used for analysis of the Department`s performance in environmental protection, safeguards and security, and safety and health of its workers and the public. This information is also used to develop lessons learned and document events that significantly impact DOE operations.

  3. Hutch for CSX Beamlines

    ScienceCinema (OSTI)

    Ed Haas

    2013-07-17

    NSLS-II will produce x-rays 10,000 times brighter than NSLS. To keep people safe from intense x-rays in the new facility, special enclosures, called hutches, will surround particular sections of beamlines.

  4. G4beamline

    Energy Science and Technology Software Center (OSTI)

    2011-05-24

    G4beamline is a single-particle-tracking simulation code based on the Geant4 toolkit. It is specifically optimized for the realistic evaluation of beam lines. It is especially useful for evaluating future muon facilities.

  5. Hutch for CSX Beamlines

    SciTech Connect (OSTI)

    Ed Haas

    2012-12-12

    NSLS-II will produce x-rays 10,000 times brighter than NSLS. To keep people safe from intense x-rays in the new facility, special enclosures, called hutches, will surround particular sections of beamlines.

  6. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ... B. Rude (510) 495-2476 BL Web Site x2092 9.3.1 Bend Atomic, molecular, and materials ... BL Web Site x2101 x2102 10.3.1 Bend X-ray fluorescence microprobe Note: This beamline ...

  7. Occurrence Reporting and Processing of Operations Information

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1997-07-21

    To establish and maintain a system for reporting operations information related to DOE-owned and -leased facilities and processing that information to identify the root causes of Unusual, Off-Normal, and Emergency Occurrences and provide for appropriate corrective action. Cancels: DOE O 232.1

  8. Microsoft Word - XMP_beamline_2007.docx

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microprobe (XMP) Beamline Description The XMP beamline is currently used both as an X-ray absorption spectroscopy beamline and an X-ray microprobe beamline. The beamline was reconfigured in 2002 to be very similar to the DCM beamline on port 5b (accepting 2 mrad), except for the added microprobe capability. Figure 1 Schematic Drawing of the XMP beamline Historically, the beamline was built as a collaborative effort between the Argonne National Laboratory and CAMD. The micro-focusing optics was

  9. Beamline 6.1.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 6.1.2 Beamline 6.1.2 Print Tuesday, 20 October 2009 08:41 Center for X-Ray Optics Soft X-Ray Microscopy Scientific disciplines: Magnetism, spin dynamics, x-ray optics,...

  10. Beamline 4.0.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.0.2 Beamline 4.0.2 Print Tuesday, 20 October 2009 08:27 Magnetic Spectroscopy and Scattering Scientific disciplines: Magnetism, materials science Endstations: Eight-pole...

  11. Beamline 4.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 4.2.2 Beamline 4.2.2 Print Tuesday, 20 October 2009 08:31 Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography...

  12. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials GENERAL BEAMLINE...

  13. Beamline 4.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Molecular Biology Consortium Multiple-Wavelength Anomalous Diffraction (MAD) and Macromolecular Crystallography (MX) Scientific discipline: Structural biology GENERAL BEAMLINE ...

  14. ALS Beamlines Directory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Note: This beamline is NOT open to general users. 4-20 keV A. MacDowell (510) 486-4276 BL Web Site x2033 4.0.2 EPU5 Magnetic spectroscopy 400-1500 eV This e-mail address is being...

  15. Beamline Insertions Manager at Jefferson Lab

    SciTech Connect (OSTI)

    Johnson, Michael C.

    2015-09-01

    The beam viewer system at Jefferson Lab provides operators and beam physicists with qualitative and quantitative information on the transverse electron beam properties. There are over 140 beam viewers installed on the 12 GeV CEBAF accelerator. This paper describes an upgrade consisting of replacing the EPICS based system tasked with managing all viewers with a mixed system utilizing EPICS and high level software. Most devices, particularly the beam viewers, cannot be safely inserted into the beam line during high-current beam operations. Software is partly responsible for protecting the machine from untimely insertions. The multiplicity of beam-blocking and beam-vulnerable devices motivate us to try a data-driven approach. The beamline insertions application components are centrally managed and configured through an object-oriented software framework created for this purpose. A rules-based engine tracks the configuration and status of every device, along with the beam status of the machine segment containing the device. The application uses this information to decide on which device actions are allowed at any given time.

  16. BEAMLINE 14-3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4-3 CURRENT STATUS: This beam line is in design. SUPPORTED TECHNIQUES: Low Energy XAS MAIN SCIENTIFIC DISCIPLINES: % TIME GENERAL USE: SCHEDULING: SOURCE: BEAM LINE SPECIFICATIONS: energy range resolution DE/E spot size flux angular acceptance focused unfocused OPTICS: MONOCHROMATOR: ABSORPTION: INSTRUMENTATION: DATA ACQUISITION AND ANALYSIS: RESPONSIBLE STAFF: BEAM LINE PHONE NUMBER: GENERAL DESCRIPTION: SCIENTIFIC APPLICATIONS / SELECTED RESULTS: April 17, 2009: SSRL Beamline 14 Sees First

  17. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 8.3.1 Print Tuesday, 20 October 2009 08:55 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural...

  18. Beamline 8.3.1

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    1 Beamline 8.3.1 Print Tuesday, 20 October 2009 08:55 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) Scientific discipline: Structural...

  19. Beamline 12.2.2

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    20 October 2009 09:31 High-Pressure Endstations: High-pressure single-crystal diffraction(in development, February 2015) High pressure laser heating GENERAL BEAMLINE...

  20. Beamline 1.4.3

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Beamline 1.4.3 Print FTIR spectromicroscopy Scientific disciplines: Biology, correlated electron systems, environmental science, geology, chemistry, polymers, soft materials...