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Sample records for atomic force microscopy

  1. Atomically resolved force microscopy at room temperature

    SciTech Connect (OSTI)

    Morita, Seizo

    2014-04-24

    Atomic force microscopy (AFM) can now not only image individual atoms but also construct atom letters using atom manipulation method even at room temperature (RT). Therefore, the AFM is the second generation atomic tool following the scanning tunneling microscopy (STM). However the AFM can image even insulating atoms, and also directly measure/map the atomic force and potential at the atomic scale. Noting these advantages, we have been developing a bottom-up nanostructuring system at RT based on the AFM. It can identify chemical species of individual atoms and then manipulate selected atom species to the predesigned site one-by-one to assemble complex nanostructures consisted of multi atom species at RT. Here we introduce our results toward atom-by-atom assembly of composite nanostructures based on the AFM at RT including the latest result on atom gating of nano-space for atom-by-atom creation of atom clusters at RT for semiconductor surfaces.

  2. NREL: Measurements and Characterization - Atomic Force Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Force Microscopy Atomic Force Microscopy (AFM) operates in several modes. In contact mode, a tip that is attached to a cantilever is scanned over the sample surface, while the force between tip and sample is measured. While the tip is scanned laterally, the force is kept constant by moving the cantilever/tip assembly up and down, so that the deflection of the cantilever is kept constant. The vertical movement of the cantilever/tip assembly is recorded and used to generate an image of the

  3. Fidelity imaging for atomic force microscopy

    SciTech Connect (OSTI)

    Ghosal, Sayan Salapaka, Murti

    2015-01-05

    Atomic force microscopy is widely employed for imaging material at the nanoscale. However, real-time measures on image reliability are lacking in contemporary atomic force microscopy literature. In this article, we present a real-time technique that provides an image of fidelity for a high bandwidth dynamic mode imaging scheme. The fidelity images define channels that allow the user to have additional authority over the choice of decision threshold that facilitates where the emphasis is desired, on discovering most true features on the sample with the possible detection of high number of false features, or emphasizing minimizing instances of false detections. Simulation and experimental results demonstrate the effectiveness of fidelity imaging.

  4. Ultrasonic-Based Mode-Synthesizing Atomic Force Microscopy -...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Only ultrasonic-based atomic force microscopy in the industry Sufficiently flexible for compatibility with spectroscopic approaches such as Raman spectroscopy Easily adaptable to ...

  5. Phase contrast and operation regimes in multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Santos, Sergio

    2014-04-07

    In amplitude modulation atomic force microscopy the attractive and the repulsive force regimes induce phase shifts above and below 90°, respectively. In the more recent multifrequency approach, however, multiple operation regimes have been reported and the theory should be revisited. Here, a theory of phase contrast in multifrequency atomic force microscopy is developed and discussed in terms of energy transfer between modes, energy dissipation and the kinetic energy and energy transfer associated with externally driven harmonics. The single frequency virial that controls the phase shift might undergo transitions in sign while the average force (modal virial) remains positive (negative)

  6. Workshop on Atomic Force Microscopy, Nanometrology and More ...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Swarna Addepalli 2012.12.17 One of my colleagues from our global research center in India, K.G. V. Siva Kumar (Sivakumar), recently attended a workshop on Atomic Force...

  7. Atomic force microscopy investigation of the giant mimivirus

    SciTech Connect (OSTI)

    Kuznetsov, Yuri G.; Xiao Chuan; Sun Siyang; Raoult, Didier; Rossmann, Michael; McPherson, Alexander

    2010-08-15

    Mimivirus was investigated by atomic force microscopy in its native state following serial degradation by lysozyme and bromelain. The 750-nm diameter virus is coated with a forest of glycosylated protein fibers of lengths about 140 nm with diameters 1.4 nm. Fibers are capped with distinctive ellipsoidal protein heads of estimated Mr = 25 kDa. The surface fibers are attached to the particle through a layer of protein covering the capsid, which is in turn composed of the major capsid protein (MCP). The latter is organized as an open network of hexagonal rings with central depressions separated by 14 nm. The virion exhibits an elaborate apparatus at a unique vertex, visible as a star shaped depression on native particles, but on defibered virions as five arms of 50 nm width and 250 nm length rising above the capsid by 20 nm. The apparatus is integrated into the capsid and not applied atop the icosahedral lattice. Prior to DNA release, the arms of the star disengage from the virion and it opens by folding back five adjacent triangular faces. A membrane sac containing the DNA emerges from the capsid in preparation for fusion with a membrane of the host cell. Also observed from disrupted virions were masses of distinctive fibers of diameter about 1 nm, and having a 7-nm periodicity. These are probably contained within the capsid along with the DNA bearing sac. The fibers were occasionally observed associated with toroidal protein clusters interpreted as processive enzymes modifying the fibers.

  8. Actuation of atomic force microscopy microcantilevers using contact acoustic nonlinearities

    SciTech Connect (OSTI)

    Torello, D.; Degertekin, F. Levent

    2013-11-15

    A new method of actuating atomic force microscopy (AFM) cantilevers is proposed in which a high frequency (>5 MHz) wave modulated by a lower frequency (∼300 kHz) wave passes through a contact acoustic nonlinearity at the contact interface between the actuator and the cantilever chip. The nonlinearity converts the high frequency, modulated signal to a low frequency drive signal suitable for actuation of tapping-mode AFM probes. The higher harmonic content of this signal is filtered out mechanically by the cantilever transfer function, providing for clean output. A custom probe holder was designed and constructed using rapid prototyping technologies and off-the-shelf components and was interfaced with an Asylum Research MFP-3D AFM, which was then used to evaluate the performance characteristics with respect to standard hardware and linear actuation techniques. Using a carrier frequency of 14.19 MHz, it was observed that the cantilever output was cleaner with this actuation technique and added no significant noise to the system. This setup, without any optimization, was determined to have an actuation bandwidth on the order of 10 MHz, suitable for high speed imaging applications. Using this method, an image was taken that demonstrates the viability of the technique and is compared favorably to images taken with a standard AFM setup.

  9. Autopilot for frequency-modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kuchuk, Kfir; Schlesinger, Itai; Sivan, Uri

    2015-10-15

    One of the most challenging aspects of operating an atomic force microscope (AFM) is finding optimal feedback parameters. This statement applies particularly to frequency-modulation AFM (FM-AFM), which utilizes three feedback loops to control the cantilever excitation amplitude, cantilever excitation frequency, and z-piezo extension. These loops are regulated by a set of feedback parameters, tuned by the user to optimize stability, sensitivity, and noise in the imaging process. Optimization of these parameters is difficult due to the coupling between the frequency and z-piezo feedback loops by the non-linear tip-sample interaction. Four proportional-integral (PI) parameters and two lock-in parameters regulating these loops require simultaneous optimization in the presence of a varying unknown tip-sample coupling. Presently, this optimization is done manually in a tedious process of trial and error. Here, we report on the development and implementation of an algorithm that computes the control parameters automatically. The algorithm reads the unperturbed cantilever resonance frequency, its quality factor, and the z-piezo driving signal power spectral density. It analyzes the poles and zeros of the total closed loop transfer function, extracts the unknown tip-sample transfer function, and finds four PI parameters and two lock-in parameters for the frequency and z-piezo control loops that optimize the bandwidth and step response of the total system. Implementation of the algorithm in a home-built AFM shows that the calculated parameters are consistently excellent and rarely require further tweaking by the user. The new algorithm saves the precious time of experienced users, facilitates utilization of FM-AFM by casual users, and removes the main hurdle on the way to fully automated FM-AFM.

  10. Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D...

    Office of Scientific and Technical Information (OSTI)

    Materials This project focused on the development of single-pass multifrequency atomic ... Country of Publication: United States Language: English Subject: 77 NANOSCIENCE AND ...

  11. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications

    SciTech Connect (OSTI)

    Morawski, Ireneusz; Spiegelberg, Richard; Korte, Stefan; Voigtländer, Bert

    2015-12-15

    A method which allows scanning tunneling microscopy (STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy (AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.

  12. Contribution to crystallographic slip assessment by means of topographic measurements achieved with atomic force microscopy

    SciTech Connect (OSTI)

    Kahloun, C.; Badji, R.; Bacroix, B.; Bouabdallah, M.

    2010-09-15

    In this paper, atomic force microscopy (AFM) is used to quantitatively characterize the plastic glide occurring during tensile deformation of a duplex 2205 stainless steel sample. We demonstrate that an appropriate treatment of the topographic image issued from AFM measurements allows precise and quantitative information about the characteristics of plastic deformation and especially the amount of crystallographic slip.

  13. Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

    SciTech Connect (OSTI)

    Ramos, Jorge R.

    2014-07-28

    The acquisition of high resolution images in atomic force microscopy (AFM) is correlated to the cantilever's tip shape, size, and imaging conditions. In this work, relative tip wear is quantified based on the evolution of a direct experimental observable in amplitude modulation atomic force microscopy, i.e., the critical amplitude. We further show that the scanning parameters required to guarantee a maximum compressive stress that is lower than the yield/fracture stress of the tip can be estimated via experimental observables. In both counts, the optimized parameters to acquire AFM images while preserving the tip are discussed. The results are validated experimentally by employing IgG antibodies as a model system.

  14. A novel self-sensing technique for tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Ruppert, Michael G.; Moheimani, S. O. Reza

    2013-12-15

    This work proposes a novel self-sensing tapping-mode atomic force microscopy operation utilizing charge measurement. A microcantilever coated with a single piezoelectric layer is simultaneously used for actuation and deflection sensing. The cantilever can be batch fabricated with existing micro electro mechanical system processes. The setup enables the omission of the optical beam deflection technique which is commonly used to measure the cantilever oscillation amplitude. Due to the high amount of capacitive feedthrough in the measured charge signal, a feedforward control technique is employed to increase the dynamic range from less than 1 dB to approximately 35 dB. Experiments show that the conditioned charge signal achieves excellent signal-to-noise ratio and can therefore be used as a feedback signal for atomic force microscopy imaging.

  15. Mapping power-law rheology of living cells using multi-frequency force modulation atomic force microscopy

    SciTech Connect (OSTI)

    Takahashi, Ryosuke; Okajima, Takaharu

    2015-10-26

    We present multi-frequency force modulation atomic force microscopy (AFM) for mapping the complex shear modulus G* of living cells as a function of frequency over the range of 50–500 Hz in the same measurement time as the single-frequency force modulation measurement. The AFM technique enables us to reconstruct image maps of rheological parameters, which exhibit a frequency-dependent power-law behavior with respect to G{sup *}. These quantitative rheological measurements reveal a large spatial variation in G* in this frequency range for single cells. Moreover, we find that the reconstructed images of the power-law rheological parameters are much different from those obtained in force-curve or single-frequency force modulation measurements. This indicates that the former provide information about intracellular mechanical structures of the cells that are usually not resolved with the conventional force measurement methods.

  16. Contact resonance atomic force microscopy imaging in air and water using photothermal excitation

    SciTech Connect (OSTI)

    Kocun, Marta; Labuda, Aleksander; Gannepalli, Anil; Proksch, Roger

    2015-08-15

    Contact Resonance Force Microscopy (CR-FM) is a leading atomic force microscopy technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been limited to imaging in air, since the “forest of peaks” frequency response associated with acoustic excitation methods effectively masks the true cantilever resonance. Using photothermal excitation results in clean contact, resonance spectra that closely match the ideal frequency response of the cantilever, allowing unambiguous and simple resonance frequency and quality factor measurements in air and liquids alike. This extends the capabilities of CR-FM to biologically relevant and other soft samples in liquid environments. We demonstrate CR-FM in air and water on both stiff silicon/titanium samples and softer polystyrene-polyethylene-polypropylene polymer samples with the quantitative moduli having very good agreement between expected and measured values.

  17. Topography and Mechanical Property Mapping of International Simple Glass Surfaces with Atomic Force Microscopy

    SciTech Connect (OSTI)

    Pierce, Eric M

    2014-01-01

    Quantitative Nanomechanical Peak Force (PF-QNM) TappingModeTM atomic force microscopy measurements are presented for the first time on polished glass surfaces. The PF-QNM technique allows for topography and mechanical property information to be measured simultaneously at each pixel. Results for the international simple glass which represents a simplified version of SON68 glass suggests an average Young s modulus of 78.8 15.1 GPa is within the experimental error of the modulus measured for SON68 glass (83.6 2 GPa) with conventional approaches. Application of the PF-QNM technique will be extended to in situ glass corrosion experiments with the goal of gaining atomic-scale insights into altered layer development by exploiting the mechanical property differences that exist between silica gel (e.g., altered layer) and pristine glass surface.

  18. Liquid contact resonance atomic force microscopy via experimental reconstruction of the hydrodynamic function

    SciTech Connect (OSTI)

    Tung, Ryan C. Killgore, Jason P.; Hurley, Donna C.

    2014-06-14

    We present a method to correct for surface-coupled inertial and viscous fluid loading forces in contact resonance (CR) atomic force microscopy (AFM) experiments performed in liquid. Based on analytical hydrodynamic theory, the method relies on experimental measurements of the AFM cantilever's free resonance peaks near the sample surface. The free resonance frequencies and quality factors in both air and liquid allow reconstruction of a continuous hydrodynamic function that can be used to adjust the CR data in liquid. Validation experiments utilizing thermally excited free and in-contact spectra were performed to assess the accuracy of our approach. Results show that the method recovers the air frequency values within approximately 6%. Knowledge of fluid loading forces allows current CR analysis techniques formulated for use in air and vacuum environments to be applied to liquid environments. Our technique greatly extends the range of measurement environments available to CR-AFM.

  19. Nanosecond switching in GeSe phase change memory films by atomic force microscopy

    SciTech Connect (OSTI)

    Bosse, James L.; Huey, Bryan D.; Grishin, Ilya; Kolosov, Oleg V.; Gyu Choi, Yong; Cheong, Byung-ki; Lee, Suyoun

    2014-02-03

    Nanosecond scale threshold switching is investigated with conducting atomic force microscopy (AFM) for an amorphous GeSe film. Switched bits exhibit 2–3 orders of magnitude variations in conductivity, as demonstrated in phase change based memory devices. Through the nm-scale AFM probe, this crystallization was achieved with pulse durations of as low as 15 ns, the fastest reported with scanning probe based methods. Conductance AFM imaging of the switched bits further reveals correlations between the switched volume, pulse amplitude, and pulse duration. The influence of film heterogeneities on switching is also directly detected, which is of tremendous importance for optimal device performance.

  20. Conductive atomic force microscopy study of local electronic transport in ZnTe thin films

    SciTech Connect (OSTI)

    Kshirsagar, Sachin D.; Krishna, M. Ghanashyam; Tewari, Surya P.

    2013-02-05

    ZnTe thin films obtained by the electron beam evaporation technique were subjected to thermal annealing at 500 Degree-Sign C for 2 hours. The as deposited films were amorphous but transformed to the crystalline state under influence of the thermal treatment. There is increase in optical absorption due to the heat treatment caused by increase in free carrier concentration. Conductive atomic force microscopy shows the presence of electronic inhomogeneities in the films. This is attributed to local compositional variations in the films. I-V analysis in these systems indicates formation of Schottky junction at the metal semiconductor (M-S) interface.

  1. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  2. Design and optimization of a harmonic probe with step cross section in multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Cai, Jiandong; Zhang, Li; Wang, Michael Yu

    2015-12-15

    In multifrequency atomic force microscopy (AFM), probe’s characteristic of assigning resonance frequencies to integer harmonics results in a remarkable improvement of detection sensitivity at specific harmonic components. The selection criterion of harmonic order is based on its amplitude’s sensitivity on material properties, e.g., elasticity. Previous studies on designing harmonic probe are unable to provide a large design capability along with maintaining the structural integrity. Herein, we propose a harmonic probe with step cross section, in which it has variable width in top and bottom steps, while the middle step in cross section is kept constant. Higher order resonance frequencies are tailored to be integer times of fundamental resonance frequency. The probe design is implemented within a structural optimization framework. The optimally designed probe is micromachined using focused ion beam milling technique, and then measured with an AFM. The measurement results agree well with our resonance frequency assignment requirement.

  3. Investigation of leakage current paths in n-GaN by conductive atomic force microscopy

    SciTech Connect (OSTI)

    Kim, Bumho; Park, Yongjo E-mail: eyoon@snu.ac.kr; Moon, Daeyoung; Nanishi, Yasushi; Joo, Kisu; Department of Nano Science and Technology, Graduate School of Convergence Science and Technology, Seoul National University, Suwon 443-270 ; Oh, Sewoung; Lee, Young Kuk; Yoon, Euijoon E-mail: eyoon@snu.ac.kr; WCU Hybrid Materials Program, Department of Materials Science and Engineering, Seoul National University, Seoul 151-742; Department of Nano Science and Technology, Graduate School of Convergence Science and Technology, Seoul National University, Suwon 443-270; Department of Materials Science and Engineering, Seoul National University, Seoul 151-742

    2014-03-10

    We have investigated electrical characteristics of leakage current paths in n-GaN layer grown by metal-organic chemical vapor deposition with conductive-atomic force microscopy (C-AFM). The C-AFM mapping shows two kinds of leakage current paths existing in the n-GaN layer: open-core dislocation and pure screw dislocation. From the localized I-V curves measured by C-AFM, we confirmed that the open-core screw dislocation shows more significant leakage current. We explained these results in terms of a modified Schottky band model based on donor states formed by oxygen segregation at the (10−10) sidewall of the open-core screw dislocation.

  4. A serial-kinematic nanopositioner for high-speed atomic force microscopy

    SciTech Connect (OSTI)

    Wadikhaye, Sachin P. Yong, Yuen Kuan; Reza Moheimani, S. O.

    2014-10-15

    A flexure-guided serial-kinematic XYZ nanopositioner for high-speed Atomic Force Microscopy is presented in this paper. Two aspects influencing the performance of serial-kinematic nanopositioners are studied in this work. First, mass reduction by using tapered flexures is proposed to increased the natural frequency of the nanopositioner. 25% increase in the natural frequency is achieved due to reduced mass with tapered flexures. Second, a study of possible sensor positioning in a serial-kinematic nanopositioner is presented. An arrangement of sensors for exact estimation of cross-coupling is incorporated in the proposed design. A feedforward control strategy based on phaser approach is presented to mitigate the dynamics and nonlinearity in the system. Limitations in design approach and control strategy are discussed in the Conclusion.

  5. Atomic-force microscopy and photoluminescence of nanostructured CdTe

    SciTech Connect (OSTI)

    Babentsov, V.; Sizov, F.; Franc, J.; Luchenko, A.; Svezhentsova, E. Tsybrii, Z.

    2013-09-15

    Low-dimensional CdTe nanorods with a diameter of 10-30 nm and a high aspect ratio that reaches 100 are studied. The nanorods are grown by the physical vapor transport method with the use of Bi precipitates on the substrates. In addition, thin films of closely packed CdTe nanorods with the transverse dimensions {approx}(100-200) nm are grown. Atomic-force microscopy shows that the cross sections of all of the nanorods were hexagonally shaped. By photoluminescence measurements, the inference about the wurtzite structure of CdTe is supported, and the structural quality, electron-phonon coupling, and defects are analyzed. On the basis of recent ab initio calculations, the nature of defects responsible for the formation of deep levels in the CdTe layers and bulk crystals are analyzed.

  6. Antimicrobial properties of analgesic kyotorphin peptides unraveled through atomic force microscopy

    SciTech Connect (OSTI)

    Ribeiro, Marta M.B.; Franquelim, Henri G.; Torcato, Ines M.; Ramu, Vasanthakumar G.; Heras, Montserrat; Bardaji, Eduard R.; Castanho, Miguel A.R.B.

    2012-04-13

    Highlights: Black-Right-Pointing-Pointer New kyotorphin derivatives have antimicrobial properties against S. aureus. Black-Right-Pointing-Pointer Atomic force microscopy show membrane disturbing effects of KTP-NH{sub 2} and IbKTP-NH{sub 2}. Black-Right-Pointing-Pointer None of the KTP derivatives are hemolytic. Black-Right-Pointing-Pointer The minimal peptidic sequence with antimicrobial activity is Tyr-Arg, if amidated. -- Abstract: Antimicrobial peptides (AMPs) are promising candidates as alternatives to conventional antibiotics for the treatment of resistant pathogens. In the last decades, new AMPs have been found from the cleavage of intact proteins with no antibacterial activity themselves. Bovine hemoglobin hydrolysis, for instance, results in AMPs and the minimal antimicrobial peptide sequence was defined as Tyr-Arg plus a positively charged amino acid residue. The Tyr-Arg dipeptide alone, known as kyotorphin (KTP), is an endogenous analgesic neuropeptide but has no antimicrobial activity itself. In previous studies new KTP derivatives combining C-terminal amidation and Ibuprofen (Ib) - KTP-NH{sub 2}, IbKTP, IbKTP-NH{sub 2} - were designed in order to improve KTP brain targeting. Those modifications succeeded in enhancing peptide-cell membrane affinity towards fluid anionic lipids and higher analgesic activity after systemic injection resulted therefrom. Here, we investigated if this affinity for anionic lipid membranes also translates into antimicrobial activity because bacteria have anionic membranes. Atomic force microscopy revealed that KTP derivatives perturbed Staphylococcus aureus membrane structure by inducing membrane blebbing, disruption and lysis. In addition, these peptides bind to red blood cells but are non-hemolytic. From the KTP derivatives tested, amidated KTP proves to be the most active antibacterial agent. The combination of analgesia and antibacterial activities with absence of toxicity is highly appealing from the clinical point of view

  7. High-speed adaptive contact-mode atomic force microscopy imaging with near-minimum-force

    SciTech Connect (OSTI)

    Ren, Juan; Zou, Qingze

    2014-07-15

    In this paper, an adaptive contact-mode imaging approach is proposed to replace the traditional contact-mode imaging by addressing the major concerns in both the speed and the force exerted to the sample. The speed of the traditional contact-mode imaging is largely limited by the need to maintain precision tracking of the sample topography over the entire imaged sample surface, while large image distortion and excessive probe-sample interaction force occur during high-speed imaging. In this work, first, the image distortion caused by the topography tracking error is accounted for in the topography quantification. Second, the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next-line topography is integrated to the topography feeedback loop to enhance the sample topography tracking. The proposed approach is demonstrated and evaluated through imaging a calibration sample of square pitches at both high speeds (e.g., scan rate of 75 Hz and 130 Hz) and large sizes (e.g., scan size of 30 ?m and 80??m). The experimental results show that compared to the traditional constant-force contact-mode imaging, the imaging speed can be increased by over 30 folds (with the scanning speed at 13 mm/s), and the probe-sample interaction force can be reduced by more than 15% while maintaining the same image quality.

  8. Imaging and quantitative data acquisition of biological cell walls with Atomic Force Microscopy and Scanning Acoustic Microscopy

    SciTech Connect (OSTI)

    Tittmann, B. R.; Xi, X.

    2014-09-01

    This chapter demonstrates the feasibility of Atomic Force Microscopy (AFM) and High Frequency Scanning Acoustic Microscopy (HF-SAM) as tools to characterize biological tissues. Both the AFM and the SAM have shown to provide imaging (with different resolution) and quantitative elasticity measuring abilities. Plant cell walls with minimal disturbance and under conditions of their native state have been examined with these two kinds of microscopy. After descriptions of both the SAM and AFM, their special features and the typical sample preparation is discussed. The sample preparation is focused here on epidermal peels of onion scales and celery epidermis cells which were sectioned for the AFM to visualize the inner surface (closest to the plasma membrane) of the outer epidermal wall. The nm-wide cellulose microfibrils orientation and multilayer structure were clearly observed. The microfibril orientation and alignment tend to be more organized in older scales compared with younger scales. The onion epidermis cell wall was also used as a test analog to study cell wall elasticity by the AFM nanoindentation and the SAM V(z) feature. The novelty in this work was to demonstrate the capability of these two techniques to analyze isolated, single layered plant cell walls in their natural state. AFM nanoindentation was also used to probe the effects of Ethylenediaminetetraacetic acid (EDTA), and calcium ion treatment to modify pectin networks in cell walls. The results suggest a significant modulus increase in the calcium ion treatment and a slight decrease in EDTA treatment. To complement the AFM measurements, the HF-SAM was used to obtain the V(z) signatures of the onion epidermis. These measurements were focused on documenting the effect of pectinase enzyme treatment. The results indicate a significant change in the V(z) signature curves with time into the enzyme treatment. Thus AFM and HF-SAM open the door to a systematic nondestructive structure and mechanical property

  9. Versatile atomic force microscopy setup combined with micro-focused X-ray beam

    SciTech Connect (OSTI)

    Slobodskyy, T. Tholapi, R.; Liefeith, L.; Hansen, W.; Zozulya, A. V. Fester, M.; Sprung, M.

    2015-06-15

    Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.

  10. Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D Mapping of Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials

    SciTech Connect (OSTI)

    Solares, Santiago D.

    2015-09-18

    This project focused on the development of single-pass multifrequency atomic force microscopy methods for the rapid multi-function nanoscale characterization of energy-relevant materials.

  11. A variable-width harmonic probe for multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Cai, Jiandong; Zhang, Li; Xia, Qi E-mail: michael.wang@nus.edu.sg; Luo, Yangjun; Wang, Michael Yu E-mail: michael.wang@nus.edu.sg

    2015-02-16

    In multifrequency atomic force microscopy (AFM) to simultaneously measure topography and material properties of specimens, it is highly desirable that the higher order resonance frequencies of the cantilever probe are assigned to be integer harmonics of the excitation frequency. The harmonic resonances are essential for significant enhancement of the probe's response at the specified harmonic frequencies. In this letter, a structural optimization technique is employed to design cantilever probes so that the ratios between one or more higher order resonance frequencies and the fundamental natural frequency are ensured to be equal to specified integers and, in the meantime, that the fundamental natural frequency is maximized. Width profile of the cantilever probe is the design variable in optimization. Thereafter, the probes were prepared by modifying a commercial probe through the focused ion beam (FIB) milling. The resonance frequencies of the FIB fabricated probes were measured with an AFM. Results of the measurement show that the optimal design of probe is as effective as design prediction.

  12. Mapping of Proteomic Composition on the Surfaces of Bacillus spores by Atomic Force Microscopy-based Immunolabeling

    SciTech Connect (OSTI)

    Plomp, M; Malkin, A J

    2008-06-02

    Atomic force microscopy provides a unique capability to image high-resolution architecture and structural dynamics of pathogens (e.g. viruses, bacteria and bacterial spores) at near molecular resolution in native conditions. Further development of atomic force microscopy in order to enable the correlation of pathogen protein surface structures with specific gene products is essential to understand the mechanisms of the pathogen life cycle. We have applied an AFM-based immunolabeling technique for the proteomic mapping of macromolecular structures through the visualization of the binding of antibodies, conjugated with nanogold particles, to specific epitopes on Bacillus spore surfaces. This information is generated while simultaneously acquiring the surface morphology of the pathogen. The immunospecificity of this labeling method was established through the utilization of specific polyclonal and monoclonal antibodies that target spore coat and exosporium epitopes of Bacillus atrophaeus and Bacillus anthracis spores.

  13. Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

    SciTech Connect (OSTI)

    Miccio, Luis A. Colmenero, Juan; Kummali, Mohammed M.; Alegra, ngel; Schwartz, Gustavo A.

    2014-05-14

    The use of an atomic force microscope for studying molecular dynamics through dielectric spectroscopy with spatial resolution in the nanometer scale is a recently developed approach. However, difficulties in the quantitative connection of the obtained data and the material dielectric properties, namely, frequency dependent dielectric permittivity, have limited its application. In this work, we develop a simple electrical model based on physically meaningful parameters to connect the atomic force microscopy (AFM) based dielectric spectroscopy experimental results with the material dielectric properties. We have tested the accuracy of the model and analyzed the relevance of the forces arising from the electrical interaction with the AFM probe cantilever. In this way, by using this model, it is now possible to obtain quantitative information of the local dielectric material properties in a broad frequency range. Furthermore, it is also possible to determine the experimental setup providing the best sensitivity in the detected signal.

  14. Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging

    SciTech Connect (OSTI)

    Guo, Senli; Santiago, Solares D; Mochalin, Vadym; Neitzel, Ioannis; Gogotsi, Yury G.; Kalinin, Sergei V; Jesse, Stephen

    2012-01-01

    Force-based scanning probe microscopies have emerged as a mainstay for probing structural and mechanical properties of materials on the nanometer and molecular scales. Despite tremendous progress achieved to date, the cantilever dynamics in single frequency scanning probe microscopies (SPM) is undefined due to having only two output variables. Here we demonstrate on diamond nanoparticles with different functionalization layers that the use of broad band detection by multiple frequency SPM allows complete information on tip-surface interactions in intermittent contact SPM to be acquired. The obtained data allows sub-3nm resolution even in ambient environment. By tuning the strength of tip-surface interaction, the information on surface state can be obtained.

  15. Probing the elastic response of microalga Scenedesmus dimorphus in dry and aqueous environments through atomic force microscopy

    SciTech Connect (OSTI)

    Warren, K. M.; Mpagazehe, J. N.; Higgs, C. F. E-mail: higgs@andrew.cmu.edu; LeDuc, P. R. E-mail: higgs@andrew.cmu.edu

    2014-10-20

    With the re-emergence of microalgae as a replacement feedstock for petroleum-derived oils, researchers are working to understand its chemical and mechanical behavior. In this work, the mechanical properties of microalgae, Scenedesmus dimorphus, were investigated at the subcellular level to determine the elastic response of cells that were in an aqueous and dried state using nano-scale indentation through atomic force microscopy. The elastic modulus of single-celled S. dimorphus cells increased over tenfold from an aqueous state to a dried state, which allows us to better understand the biophysical response of microalgae to stress.

  16. Local elastic modulus of RF sputtered HfO{sub 2} thin film by atomic force acoustic microscopy

    SciTech Connect (OSTI)

    Jena, S. Tokas, R. B. Sarkar, P. Thakur, S.; Sahoo, N. K.; Misal, J. S.; Rao, K. D.

    2014-04-24

    Atomic force acoustic microscopy (AFAM) is a useful nondestructive technique for measurement of local elastic modulus of materials at nano-scale spatial resolution by measuring the contact resonance spectra for higher order modes of the AFM cantilever. The elastic modulus of RF sputtered HfO{sub 2} thin film has been measured quantitatively, using reference approach in which measurements are performed on the test and reference samples. Using AFAM, the measured elastic modulus of the HfO{sub 2} thin film is 223±27 GPa, which is in agreement with the literature value of 220±40 GPa for atomic layer deposited HfO{sub 2} thin film using nanoindentation technique.

  17. Atomic Force Microscopy Studies of Lipophosphoglycan (LPG) Molecules in Lipid Bilayers

    SciTech Connect (OSTI)

    LAST, JULIE A.; HUBER, TINA; SASAKI, DARRYL Y.; SALVATORE, BRIAN; TURCO, SALVATORE J.

    2003-03-01

    Lipophosphoglycan (LPG) is a lypopolysaccharide found on the surface of the parasite Leishmania donovani that is thought to play an essential role in the infection of humans with leishamniasis. LPG acts as an adhesion point for the parasite to the gut of the sand fly, whose bite is responsible for transmitting the disease. In addition, LPG acts to inhibit protein kinase C (PKC) in the human macrophage, possibly by structural changes in the membrane. The Ca{sup 2+} ion is believed to play a role in the infection cycle, acting both as a crosslinker between LPG molecules and by playing a part in modulating PKC activity. To gain insight into the structure of LPG within a supported lipid membrane and into the structural changes that occur due to Ca{sup 2+} ions, we have employed the atomic force microscope (AFM). We have observed that the LPG molecules inhibit bilayer fusion, resulting in bilayer islands on the mica surface. One experiment suggests that the LPG molecules are parallel to the mica surface and that the structure of the LPG changes upon addition of Ca{sup 2+}, with an increase in the height of the LPG molecules from the bilayer surface and an almost complete coverage of LPG on the bilayer island.

  18. A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Solares, Santiago D.

    2015-11-26

    This study introduces a quasi-3-dimensional (Q3D) viscoelastic model and software tool for use in atomic force microscopy (AFM) simulations. The model is based on a 2-dimensional array of standard linear solid (SLS) model elements. The well-known 1-dimensional SLS model is a textbook example in viscoelastic theory but is relatively new in AFM simulation. It is the simplest model that offers a qualitatively correct description of the most fundamental viscoelastic behaviors, namely stress relaxation and creep. However, this simple model does not reflect the correct curvature in the repulsive portion of the force curve, so its application in the quantitative interpretationmore » of AFM experiments is relatively limited. In the proposed Q3D model the use of an array of SLS elements leads to force curves that have the typical upward curvature in the repulsive region, while still offering a very low computational cost. Furthermore, the use of a multidimensional model allows for the study of AFM tips having non-ideal geometries, which can be extremely useful in practice. Examples of typical force curves are provided for single- and multifrequency tappingmode imaging, for both of which the force curves exhibit the expected features. Lastly, a software tool to simulate amplitude and phase spectroscopy curves is provided, which can be easily modified to implement other controls schemes in order to aid in the interpretation of AFM experiments.« less

  19. A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Solares, Santiago D.

    2015-11-26

    This study introduces a quasi-3-dimensional (Q3D) viscoelastic model and software tool for use in atomic force microscopy (AFM) simulations. The model is based on a 2-dimensional array of standard linear solid (SLS) model elements. The well-known 1-dimensional SLS model is a textbook example in viscoelastic theory but is relatively new in AFM simulation. It is the simplest model that offers a qualitatively correct description of the most fundamental viscoelastic behaviors, namely stress relaxation and creep. However, this simple model does not reflect the correct curvature in the repulsive portion of the force curve, so its application in the quantitative interpretation of AFM experiments is relatively limited. In the proposed Q3D model the use of an array of SLS elements leads to force curves that have the typical upward curvature in the repulsive region, while still offering a very low computational cost. Furthermore, the use of a multidimensional model allows for the study of AFM tips having non-ideal geometries, which can be extremely useful in practice. Examples of typical force curves are provided for single- and multifrequency tappingmode imaging, for both of which the force curves exhibit the expected features. Lastly, a software tool to simulate amplitude and phase spectroscopy curves is provided, which can be easily modified to implement other controls schemes in order to aid in the interpretation of AFM experiments.

  20. Note: A silicon-on-insulator microelectromechanical systems probe scanner for on-chip atomic force microscopy

    SciTech Connect (OSTI)

    Fowler, Anthony G.; Maroufi, Mohammad; Moheimani, S. O. Reza

    2015-04-15

    A new microelectromechanical systems-based 2-degree-of-freedom (DoF) scanner with an integrated cantilever for on-chip atomic force microscopy (AFM) is presented. The silicon cantilever features a layer of piezoelectric material to facilitate its use for tapping mode AFM and enable simultaneous deflection sensing. Electrostatic actuators and electrothermal sensors are used to accurately position the cantilever within the x-y plane. Experimental testing shows that the cantilever is able to be scanned over a 10 μm × 10 μm window and that the cantilever achieves a peak-to-peak deflection greater than 400 nm when excited at its resonance frequency of approximately 62 kHz.

  1. Imaging and measuring the biophysical properties of Fc gamma receptors on single macrophages using atomic force microscopy

    SciTech Connect (OSTI)

    Li, Mi; University of Chinese Academy of Sciences, Beijing 100049 ; Liu, Lianqing; Xi, Ning; Wang, Yuechao; Xiao, Xiubin; Zhang, Weijing

    2013-09-06

    Highlights: Nanoscale cellular ultra-structures of macrophages were observed. The binding affinities of Fc?Rs were measured directly on macrophages. The nanoscale distributions of Fc?Rs were mapped on macrophages. -- Abstract: Fc gamma receptors (Fc?R), widely expressed on effector cells (e.g., NK cells, macrophages), play an important role in clinical cancer immunotherapy. The binding of Fc?Rs to the Fc portions of antibodies that are attached to the target cells can activate the antibody-dependent cell-mediated cytotoxicity (ADCC) killing mechanism which leads to the lysis of target cells. In this work, we used atomic force microscopy (AFM) to observe the cellular ultra-structures and measure the biophysical properties (affinity and distribution) of Fc?Rs on single macrophages in aqueous environments. AFM imaging was used to obtain the topographies of macrophages, revealing the nanoscale cellular fine structures. For molecular interaction recognition, antibody molecules were attached onto AFM tips via a heterobifunctional polyethylene glycol (PEG) crosslinker. With AFM single-molecule force spectroscopy, the binding affinities of Fc?Rs were quantitatively measured on single macrophages. Adhesion force mapping method was used to localize the Fc?Rs, revealing the nanoscale distribution of Fc?Rs on local areas of macrophages. The experimental results can improve our understanding of Fc?Rs on macrophages; the established approach will facilitate further research on physiological activities involved in antibody-based immunotherapy.

  2. Parameter sensitivity analysis of nonlinear piezoelectric probe in tapping mode atomic force microscopy for measurement improvement

    SciTech Connect (OSTI)

    McCarty, Rachael; Nima Mahmoodi, S.

    2014-02-21

    The equations of motion for a piezoelectric microcantilever are derived for a nonlinear contact force. The analytical expressions for natural frequencies and mode shapes are obtained. Then, the method of multiple scales is used to analyze the analytical frequency response of the piezoelectric probe. The effects of nonlinear excitation force on the microcantilever beam's frequency and amplitude are analytically studied. The results show a frequency shift in the response resulting from the force nonlinearities. This frequency shift during contact mode is an important consideration in the modeling of AFM mechanics for generation of more accurate imaging. Also, a sensitivity analysis of the system parameters on the nonlinearity effect is performed. The results of a sensitivity analysis show that it is possible to choose parameters such that the frequency shift minimizes. Certain parameters such as tip radius, microcantilever beam dimensions, and modulus of elasticity have more influence on the nonlinearity of the system than other parameters. By changing only three parameters—tip radius, thickness, and modulus of elasticity of the microbeam—a more than 70% reduction in nonlinearity effect was achieved.

  3. Topographical and Chemical Imaging of a Phase Separated Polymer Using a Combined Atomic Force Microscopy/Infrared Spectroscopy/Mass Spectrometry Platform

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Tai, Tamin; Karácsony, Orsolya; Bocharova, Vera; Van Berkel, Gary J.; Kertesz, Vilmos

    2016-02-18

    This article describes how the use of a hybrid atomic force microscopy/infrared spectroscopy/mass spectrometry imaging platform was demonstrated for the acquisition and correlation of nanoscale sample surface topography and chemical images based on infrared spectroscopy and mass spectrometry.

  4. Selection of higher eigenmode amplitude based on dissipated power and virial contrast in bimodal atomic force microscopy

    SciTech Connect (OSTI)

    Diaz, Alfredo J.; Eslami, Babak; Lpez-Guerra, Enrique A.; Solares, Santiago D.

    2014-09-14

    This paper explores the effect of the amplitude ratio of the higher to the fundamental eigenmode in bimodal atomic force microscopy (AFM) on the phase contrast and the dissipated power contrast of the higher eigenmode. We explore the optimization of the amplitude ratio in order to maximize the type of contrast that is most relevant to the particular study. Specifically, we show that the trends in the contrast range behave differently for different quantities, especially the dissipated power and the phase, with the former being more meaningful than the latter (a similar analysis can be carried out using the virial, for which we also provide a brief example). Our work is based on numerical simulations using two different conservative-dissipative tip-sample models, including the standard linear solid and the combination of a dissipation coefficient with a conservative model, as well as experimental images of thin film Nafion{sup } proton exchange polymers. We focus on the original bimodal AFM method, where the higher eigenmode is driven with constant amplitude and frequency (i.e., in open loop).

  5. Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kobayashi, Kei; Yamada, Hirofumi; Matsushige, Kazumi

    2011-03-15

    We recently reported the analysis of the frequency noise in the frequency modulation atomic force microscopy (FM-AFM) both in high-Q and low-Q environments [Rev. Sci. Instrum. 80, 043708 (2009)]. We showed in the paper that the oscillator noise, the frequency fluctuation of the oscillator, becomes prominent in the modulation frequency lower than f{sub 0}/2Q, where f{sub 0} and Q are the resonance frequency and Q-factor. The magnitude of the oscillator noise is determined by the slope of the phase versus frequency curve of the cantilever at f{sub 0}. However, in actual FM-AFM in liquids, the phase versus frequency curve may not be always ideal because of the existence of various phase shifting elements (PSEs). For example, the spurious resonance peaks caused by the acoustic excitation and a band-pass filter in the self-oscillation loop increase the slope of the phase versus frequency curve. Due to those PSEs, the effective Q-factor is often increased from the intrinsic Q-factor of the cantilever. In this article, the frequency noise in the FM-AFM system with the PSEs in the self-oscillation loop is analyzed to show that the oscillator noise is reduced by the increase of the effective Q-factor. It is also shown that the oscillation frequency deviates from the resonance frequency due to the increase of the effective Q-factor, thereby causing the reduction in the frequency shift signal with the same factor. Therefore the increase of the effective Q-factor does not affect the signal-to-noise ratio in the frequency shift measurement, but it does affect the quantitativeness of the measured force in the FM-AFM. Furthermore, the reduction of the frequency noise and frequency shift by the increase of the effective Q-factor were confirmed by the experiments.

  6. Direct observation of electron emission from the grain boundaries of chemical vapour deposition diamond films by tunneling atomic force microscopy

    SciTech Connect (OSTI)

    Chatterjee, Vijay; Harniman, Robert; May, Paul W.; Barhai, P. K.

    2014-04-28

    The emission of electrons from diamond in vacuum occurs readily as a result of the negative electron affinity of the hydrogenated surface due to features with nanoscale dimensions, which can concentrate electric fields high enough to induce electron emission from them. Electrons can be emitted as a result of an applied electric field (field emission) with possible uses in displays or cold-cathode devices. Alternatively, electrons can be emitted simply by heating the diamond in vacuum to temperatures as low as 350?C (thermionic emission), and this may find applications in solar energy generation or energy harvesting devices. Electron emission studies usually use doped polycrystalline diamond films deposited onto Si or metallic substrates by chemical vapor deposition, and these films have a rough, faceted morphology on the micron or nanometer scale. Electron emission is often improved by patterning the diamond surface into sharp points or needles, the idea being that the field lines concentrate at the points lowering the barrier for electron emission. However, there is little direct evidence that electrons are emitted from these sharp tips. The few reports in the literature that have studied the emission sites suggested that emission came from the grain boundaries and not the protruding regions. We now present direct observation of the emission sites over a large area of polycrystalline diamond using tunneling atomic force microscopy. We confirm that the emission current comes mostly from the grain boundaries, which is consistent with a model for emission in which the non-diamond phase is the source of electrons with a threshold that is determined by the surrounding hydrogenated diamond surface.

  7. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2006-08-22

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  8. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V.; Wang, Chengpu

    2004-11-16

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  9. A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy

    SciTech Connect (OSTI)

    Mullin, Nic Hobbs, Jamie K.

    2014-11-15

    Calibration of lateral forces and displacements has been a long standing problem in lateral force microscopies. Recently, it was shown by Wagner et al. that the thermal noise spectrum of the first torsional mode may be used to calibrate the deflection sensitivity of the detector. This method is quick, non-destructive and may be performed in situ in air or liquid. Here we make a full quantitative comparison of the lateral inverse optical lever sensitivity obtained by the lateral thermal noise method and the shape independent method developed by Anderson et al. We find that the thermal method provides accurate results for a wide variety of rectangular cantilevers, provided that the geometry of the cantilever is suitable for torsional stiffness calibration by the torsional Sader method, in-plane bending of the cantilever may be eliminated or accounted for and that any scaling of the lateral deflection signal between the measurement of the lateral thermal noise and the measurement of the lateral deflection is eliminated or corrected for. We also demonstrate that the thermal method may be used to characterize the linearity of the detector signal as a function of position, and find a deviation of less than 8% for the instrument used.

  10. Electric transport through nanometric CoFe{sub 2}O{sub 4} thin films investigated by conducting atomic force microscopy

    SciTech Connect (OSTI)

    Foerster, M.; Gutierrez, D. F.; Rigato, F.; Fontcuberta, J.; Rebled, J. M.; Peiro, F.

    2012-01-01

    A systematic study of electric transport through thin (2-8 nm) CoFe{sub 2}O{sub 4} films deposited on epitaxial SrRuO{sub 3} bottom electrodes was performed by conducting atomic force microscopy (CAFM). Experimental procedures to investigate transport through thin insulating films by CAFM are critically revised, and the potential of CoFe{sub 2}O{sub 4} films for the use as spin-filtering barriers is assessed. It is concluded that, at room-temperature, a non-tunnel channel significantly contributes to the electric transport, thus limiting the spin-filtering efficiency.

  11. True atomic-scale imaging of a spinel Li{sub 4}Ti{sub 5}O{sub 12}(111) surface in aqueous solution by frequency-modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kitta, Mitsunori, E-mail: m-kitta@aist.go.jp; Kohyama, Masanori [Research Institute for Ubiquitous Energy Devices, National Institute of Advanced Industrial Science and Technology, 1-8-31 Midorigaoka, Ikeda, Osaka 563-8577 (Japan); Onishi, Hiroshi [Department of Chemistry, Graduate School of Science, Kobe University 1-1 Rokkodai, Nada, Kobe 657-8501 (Japan)

    2014-09-15

    Spinel-type lithium titanium oxide (LTO; Li{sub 4}Ti{sub 5}O{sub 12}) is a negative electrode material for lithium-ion batteries. Revealing the atomic-scale surface structure of LTO in liquid is highly necessary to investigate its surface properties in practical environments. Here, we reveal an atomic-scale image of the LTO(111) surface in LiCl aqueous solution using frequency-modulation atomic force microscopy. Atomically flat terraces and single steps having heights of multiples of 0.5?nm were observed in the aqueous solution. Hexagonal bright spots separated by 0.6?nm were also observed on the flat terrace part, corresponding to the atomistic contrast observed in the ultrahigh vacuum condition, which suggests that the basic atomic structure of the LTO(111) surface is retained without dramatic reconstruction even in the aqueous solution.

  12. Atomic Force Microscope

    SciTech Connect (OSTI)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  13. Cross-Sectional Conductive Atomic Force Microscopy of CdTe/CdS Solar Cells: Effects of Etching and Back-Contact Processes; Preprint

    SciTech Connect (OSTI)

    Moutinho, H. R.; Dhere, R. G.; Jiang, C.-S.; Gessert, T. A.; Duda, A. M.; Young, M.; Metzger, W. K.; Li, X.; Al-Jassim, M. M.

    2006-05-01

    We investigated the effects of the etching processes using bromine and nitric-phosphoric acid solutions, as well as of Cu, in the bulk electrical conductivity of CdTe/CdS solar cells using conductive atomic force microscopy (C-AFM). Although the etching process can create a conductive layer on the surface of the CdTe, the layer is very shallow. In contrast, the addition of a thin layer of Cu to the surface creates a conductive layer inside the CdTe that is not uniform in depth, is concentrated at grains boundaries, and may short circuit the device if the CdTe is too thin. The etching process facilitates the Cu diffusion and results in thicker conductive layers. The existence of this inhomogeneous conductive layer directly affects the current transport and is probably the reason for needing thick CdTe in these devices.

  14. Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

    SciTech Connect (OSTI)

    Collins, Liam; Jesse, Stephen; Kilpatrick, J.; Tselev, Alexander; Okatan, Mahmut Baris; Kalinin, Sergei V.; Rodriguez, Brian

    2015-01-01

    Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q water and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid–liquid interface.

  15. Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam; Jesse, Stephen; Kilpatrick, J.; Tselev, Alexander; Okatan, Mahmut Baris; Kalinin, Sergei V.; Rodriguez, Brian

    2015-01-01

    Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q watermore » and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid–liquid interface.« less

  16. Piezoresponse Force Microscopy: A Window into Electromechanical...

    Office of Scientific and Technical Information (OSTI)

    Behavior at the Nanoscale Citation Details In-Document Search Title: Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Authors: Bonnell, ...

  17. Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform

    SciTech Connect (OSTI)

    Ovchinnikova, Olga S.; Tai, Tamin; Bocharova, Vera; Okatan, Mahmut Baris; Belianinov, Alex; Kertesz, Vilmos; Jesse, Stephen; Van Berkel, Gary J.

    2015-03-18

    The advancement of a hybrid atomic force microscopy/mass spectrometry imaging platform demonstrating for the first time co-registered topographical, band excitation nanomechanical, and mass spectral imaging of a surface using a single instrument is reported. The mass spectrometry-based chemical imaging component of the system utilized nanothermal analysis probes for pyrolytic surface sampling followed by atmospheric pressure chemical ionization of the gas phase species produced with subsequent mass analysis. We discuss the basic instrumental setup and operation and the multimodal imaging capability and utility are demonstrated using a phase separated polystyrene/poly(2-vinylpyridine) polymer blend thin film. The topography and band excitation images showed that the valley and plateau regions of the thin film surface were comprised primarily of one of the two polymers in the blend with the mass spectral chemical image used to definitively identify the polymers at the different locations. Data point pixel size for the topography (390 nm x 390 nm), band excitation (781 nm x 781 nm), mass spectrometry (690 nm x 500 nm) images was comparable and submicrometer in all three cases, but the data voxel size for each of the three images was dramatically different. The topography image was uniquely a surface measurement, whereas the band excitation image included information from an estimated 10 nm deep into the sample and the mass spectral image from 110-140 nm in depth. Moreover, because of this dramatic sampling depth variance, some differences in the band excitation and mass spectrometry chemical images were observed and were interpreted to indicate the presence of a buried interface in the sample. The spatial resolution of the mass spectral image was estimated to be between 1.5 m 2.6 m, based on the ability to distinguish surface features in that image that were also observed in the other images.

  18. Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ovchinnikova, Olga S.; Tai, Tamin; Bocharova, Vera; Okatan, Mahmut Baris; Belianinov, Alex; Kertesz, Vilmos; Jesse, Stephen; Van Berkel, Gary J.

    2015-03-18

    The advancement of a hybrid atomic force microscopy/mass spectrometry imaging platform demonstrating for the first time co-registered topographical, band excitation nanomechanical, and mass spectral imaging of a surface using a single instrument is reported. The mass spectrometry-based chemical imaging component of the system utilized nanothermal analysis probes for pyrolytic surface sampling followed by atmospheric pressure chemical ionization of the gas phase species produced with subsequent mass analysis. We discuss the basic instrumental setup and operation and the multimodal imaging capability and utility are demonstrated using a phase separated polystyrene/poly(2-vinylpyridine) polymer blend thin film. The topography and band excitation images showedmore » that the valley and plateau regions of the thin film surface were comprised primarily of one of the two polymers in the blend with the mass spectral chemical image used to definitively identify the polymers at the different locations. Data point pixel size for the topography (390 nm x 390 nm), band excitation (781 nm x 781 nm), mass spectrometry (690 nm x 500 nm) images was comparable and submicrometer in all three cases, but the data voxel size for each of the three images was dramatically different. The topography image was uniquely a surface measurement, whereas the band excitation image included information from an estimated 10 nm deep into the sample and the mass spectral image from 110-140 nm in depth. Moreover, because of this dramatic sampling depth variance, some differences in the band excitation and mass spectrometry chemical images were observed and were interpreted to indicate the presence of a buried interface in the sample. The spatial resolution of the mass spectral image was estimated to be between 1.5 m 2.6 m, based on the ability to distinguish surface features in that image that were also observed in the other images.« less

  19. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    SciTech Connect (OSTI)

    Balantekin, M.; Sat?r, S.; Torello, D.; De?ertekin, F. L.

    2014-12-15

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  20. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2003-01-01

    An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

  1. Hyperbaric Hydrothermal Atomic Force Microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2003-07-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  2. Hyperbaric hydrothermal atomic force microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2002-01-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  3. Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Solares, Santiago D.

    2016-04-15

    Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip-sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surfacemore » as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young's modulus. Relevant cases are discussed for single-and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip-sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. As a result, a multifrequency AFM simulation tool based on the above sample model is provided as supporting information.« less

  4. Scanning magnetoresistance microscopy of atom chips

    SciTech Connect (OSTI)

    Volk, M.; Whitlock, S.; Wolff, C. H.; Hall, B. V.; Sidorov, A. I.

    2008-02-15

    Surface based geometries of microfabricated wires or patterned magnetic films can be used to magnetically trap and manipulate ultracold neutral atoms or Bose-Einstein condensates. We investigate the magnetic properties of such atom chips using a scanning magnetoresistive (MR) microscope with high spatial resolution and high field sensitivity. By comparing MR scans of a permanent magnetic atom chip to field profiles obtained using ultracold atoms, we show that MR sensors are ideally suited to observe small variations of the magnetic field caused by imperfections in the wires or magnetic materials which ultimately lead to fragmentation of ultracold atom clouds. Measurements are also provided for the magnetic field produced by a thin current-carrying wire with small geometric modulations along the edge. Comparisons of our measurements with a full numeric calculation of the current flow in the wire and the subsequent magnetic field show excellent agreement. Our results highlight the use of scanning MR microscopy as a convenient and powerful technique for precisely characterizing the magnetic fields produced near the surface of atom chips.

  5. Intermodulation electrostatic force microscopy for imaging surface photo-voltage

    SciTech Connect (OSTI)

    Borgani, Riccardo Forchheimer, Daniel; Thorn, Per-Anders; Haviland, David B.; Bergqvist, Jonas; Ingans, Olle

    2014-10-06

    We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear capacitance gives intermodulation products of the two drive frequencies near the cantilever resonance, where they are measured with high signal to noise ratio. Analysis of this intermodulation response allows for quantitative reconstruction of the contact potential difference. We derive the theory of the method, validate it with numerical simulation and a control experiment, and we demonstrate its utility for fast imaging of the surface photo-voltage on an organic photo-voltaic material.

  6. Photothermally excited force modulation microscopy for broadband nanomechanical property measurements

    SciTech Connect (OSTI)

    Wagner, Ryan Killgore, Jason P.

    2015-11-16

    We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive frequency, thus avoiding the problem of spurious resonant vibrations that hinder piezoelectric excitation schemes. A complication of PTE FMM is that the sub-resonance cantilever vibration shape is fundamentally different compared to piezoelectric excitation. By directly measuring the vibrational shape of the cantilever, we show that PTE FMM is an accurate nanomechanical characterization method. PTE FMM is a pathway towards the characterization of frequency sensitive specimens such as polymers and biomaterials with frequency range limited only by the resonance frequency of the cantilever and the low frequency limit of the AFM.

  7. Effect of current compliance and voltage sweep rate on the resistive switching of HfO{sub 2}/ITO/Invar structure as measured by conductive atomic force microscopy

    SciTech Connect (OSTI)

    Wu, You-Lin Liao, Chun-Wei; Ling, Jing-Jenn

    2014-06-16

    The electrical characterization of HfO{sub 2}/ITO/Invar resistive switching memory structure was studied using conductive atomic force microscopy (AFM) with a semiconductor parameter analyzer, Agilent 4156C. The metal alloy Invar was used as the metal substrate to ensure good ohmic contact with the substrate holder of the AFM. A conductive Pt/Ir AFM tip was placed in direct contact with the HfO{sub 2} surface, such that it acted as the top electrode. Nanoscale current-voltage (I-V) characteristics of the HfO{sub 2}/ITO/Invar structure were measured by applying a ramp voltage through the conductive AFM tip at various current compliances and ramp voltage sweep rates. It was found that the resistance of the low resistance state (RLRS) decreased with increasing current compliance value, but resistance of high resistance state (RHRS) barely changed. However, both the RHRS and RLRS decreased as the voltage sweep rate increased. The reasons for this dependency on current compliance and voltage sweep rate are discussed.

  8. Full information acquisition in piezoresponse force microscopy

    SciTech Connect (OSTI)

    Somnath, Suhas; Belianinov, Alex; Jesse, Stephen; Kalinin, Sergei V.

    2015-12-28

    The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.

  9. Full information acquisition in piezoresponse force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Somnath, Suhas; Belianinov, Alex; Jesse, Stephen; Kalinin, Sergei V.

    2015-12-28

    The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separatemore » the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.« less

  10. Half-harmonic Kelvin probe force microscopy with transfer function...

    Office of Scientific and Technical Information (OSTI)

    Using linear and half-harmonic BE enables quantitative correction of the cantilever transfer function. Half-harmonic band excitation Kelvin probe force microscopy (HBE KPFM) thus ...

  11. Model based control of dynamic atomic force microscope

    SciTech Connect (OSTI)

    Lee, Chibum; Salapaka, Srinivasa M.

    2015-04-15

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H{sub ∞} control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  12. Atomic force microscopy and x-ray photoelectron spectroscopy investigations of the morphology and chemistry of a PdCl{sub 2}/SnCl{sub 2} electroless plating catalysis system adsorbed onto shape memory alloy particles

    SciTech Connect (OSTI)

    Silvain, J.F.; Fouassier, O.; Lescaux, S.

    2004-11-01

    A study of the different stages of the electroless deposition of copper on micronic NiTi shape memory alloy particles activated by one-step and two-step methods has been conducted from both a chemical and a morphological point of view. The combination of x-ray photoelectron spectroscopy (XPS) measurements and atomic force microscopy (AFM) imaging has allowed detection of the distribution of the formed compounds and depth quantification and estimation of the surface topographic parameters. For the two-step method, at the sensitization of the early stages, it is observed by AFM that Sn is absorbed in form of clusters that tend to completely cover the surface and form a continuous film. XPS analysis have shown that Sn and Pd are first absorbed in form of oxide (SnO{sub 2} and PdO) and hydroxide [Sn(OH){sub 4}]. After the entire sensitization step, the NiTi substrate is covered with Sn-based compounds. After the sensitization and the activation steps the powder roughness increases. Behavior of the Sn and Pd growth for the one-step method does not follow the behavior found for the two-step method. Indeed, XPS analysis shows a three-dimensional (3D) growth of Pd clusters on top of a mixture of metallic tin, oxide (SnO) and hydroxide [Sn(OH){sub 2}]. These Pd clusters are covered with a thin layer of Pd-oxide contamination induced by the electroless process. The mean roughness for the one-step and two-step processes are equivalent. After copper deposition, the decrease of mean roughness is attributed to a filling of surface valleys, observed after the Sn-Pd coating step.

  13. Band Excitation Method Applicable to Scanning Probe Microscopy...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    force microscopy, atomic force acoustic microscopy, and piezoresponse force microscopy. It is relevant to all SPM manufacturers and can yield data about a sample's electrical, ...

  14. Friction forces on atoms after acceleration

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Intravaia, Francesco; Mkrtchian, Vanik E.; Buhmann, Stefan Yoshi; Scheel, Stefan; Dalvit, Diego A. R.; Henkel, Carsten

    2015-05-12

    The aim of this study is to revisit the calculation of atom–surface quantum friction in the quantum field theory formulation put forward by Barton (2010 New J. Phys. 12 113045). We show that the power dissipated into field excitations and the associated friction force depend on how the atom is boosted from being initially at rest to a configuration in which it is moving at constant velocity (v) parallel to the planar interface. In addition, we point out that there is a subtle cancellation between the one-photon and part of the two-photon dissipating power, resulting in a leading order contributionmore » to the frictional power which goes as v4. These results are also confirmed by an alternative calculation of the average radiation force, which scales as v3.« less

  15. Friction forces on atoms after acceleration

    SciTech Connect (OSTI)

    Intravaia, Francesco; Mkrtchian, Vanik E.; Buhmann, Stefan Yoshi; Scheel, Stefan; Dalvit, Diego A. R.; Henkel, Carsten

    2015-05-12

    The aim of this study is to revisit the calculation of atom–surface quantum friction in the quantum field theory formulation put forward by Barton (2010 New J. Phys. 12 113045). We show that the power dissipated into field excitations and the associated friction force depend on how the atom is boosted from being initially at rest to a configuration in which it is moving at constant velocity (v) parallel to the planar interface. In addition, we point out that there is a subtle cancellation between the one-photon and part of the two-photon dissipating power, resulting in a leading order contribution to the frictional power which goes as v4. These results are also confirmed by an alternative calculation of the average radiation force, which scales as v3.

  16. Atomic resolution scanning tunneling microscopy in a cryogen free dilution refrigerator at 15 mK

    SciTech Connect (OSTI)

    Haan, A. M. J. den Wijts, G. H. C. J.; Galli, F.; Oosterkamp, T. H.; Usenko, O.; Baarle, G. J. C. van; Zalm, D. J. van der

    2014-03-15

    Pulse tube refrigerators are becoming more common, because they are cost efficient and demand less handling than conventional (wet) refrigerators. However, a downside of a pulse tube system is the vibration level at the cold-head, which is in most designs several micrometers. We implemented vibration isolation techniques which significantly reduced vibration levels at the experiment. These optimizations were necessary for the vibration sensitive magnetic resonance force microscopy experiments at milli-kelvin temperatures for which the cryostat is intended. With these modifications we show atomic resolution scanning tunneling microscopy on graphite. This is promising for scanning probe microscopy applications at very low temperatures.

  17. A new ion sensing deep atomic force microscope

    SciTech Connect (OSTI)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  18. Photothermal excitation setup for a modified commercial atomic force microscope

    SciTech Connect (OSTI)

    Adam, Holger; Rode, Sebastian; Schreiber, Martin; Kühnle, Angelika; Kobayashi, Kei; Yamada, Hirofumi

    2014-02-15

    High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and to maintain the low noise level of the original setup with a typical deflection noise density of about 15 fm/√(Hz) measured in aqueous solution. The success of the modification is illustrated by a comparison of the resonance spectra obtained with piezoelectric and photothermal excitation. The performance of the systems is demonstrated by presenting high-resolution images on bare calcite in liquid as well as organic adsorbates (Alizarin Red S) on calcite with simultaneous atomic resolution of the underlying calcite substrate.

  19. Exploring Local Electrostatic Effects with Scanning Probe Microscopy: Implications for Piezoresponse Force Microscopy and Triboelectricity

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Balke, Nina; Maksymovych, Petro; Jesse, Stephen; Kravchenko, Ivan I.; Li, Qian; Kalinin, Sergei V.

    2014-09-25

    The implementation of contact mode Kelvin probe force microscopy (KPFM) utilizes the electrostatic interactions between tip and sample when the tip and sample are in contact with each other. Surprisingly, the electrostatic forces in contact are large enough to be measured even with tips as stiff as 4.5 N/m. As for traditional non-contact KPFM, the signal depends strongly on electrical properties of the sample, such as the dielectric constant, and the tip-properties, such as the stiffness. Since the tip is in contact with the sample, bias-induced changes in the junction potential between tip and sample can be measured with highermore » lateral and temporal resolution compared to traditional non-contact KPFM. Significant and reproducible variations of tip-surface capacitance are observed and attributed to surface electrochemical phenomena. Lastly, observations of significant surface charge states at zero bias and strong hysteretic electromechanical responses at non-ferroelectric surface have significant implications for fields such as triboelectricity and piezoresponse force microscopy.« less

  20. Physical mechanisms of megahertz vibrations and nonlinear detection in ultrasonic force and related microscopies

    SciTech Connect (OSTI)

    Bosse, J. L.; Huey, B. D.; Tovee, P. D.; Kolosov, O. V.

    2014-04-14

    Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced nanoscale property mapping to video rates, allowed use of cantilever dynamics for mapping nanomechanical properties of stiff materials, sensing ?s time scale phenomena in nanostructures, and enabled detection of subsurface features with nanoscale resolution. All of these methods critically depend on the generally poor characterized HF behaviour of AFM cantilevers in contact with a studied sample, spatial and frequency response of piezotransducers, and transfer of ultrasonic vibrations between the probe and a specimen. Focusing particularly on Ultrasonic Force Microscopy (UFM), this work is also applicable to waveguide UFM, heterodyne force microscopy, and near-field holographic microscopy, all methods that exploit nonlinear tip-surface force interactions at high frequencies. Leveraging automated multidimensional measurements, spectroscopic UFM (sUFM) is introduced to investigate a range of common experimental parameters, including piezotransducer excitation frequency, probed position, ultrasonic amplitude, cantilever geometry, spring constant, and normal force. Consistent with studies of influence of each of these factors, the data-rich sUFM signatures allow efficient optimization of ultrasonic-AFM based measurements, leading to best practices recommendations of using longer cantilevers with lower fundamental resonance, while at the same time increasing the central frequency of HF piezo-actuators, and only comparing results within areas on the order of few ?m{sup 2} unless calibrated directly or compared with in-the-imaged area standards. Diverse materials such as Si, Cr, and photoresist are specifically investigated. This work thereby provides essential insight into the reliable use of MHz vibrations with AFM and provides direct evidence substantiating phenomena such as sensitivity to adhesion, diminished friction for certain ultrasonic conditions, and the particular

  1. Ultra-sensitive Magnetic Microscopy with an Atomic Magnetometer...

    Office of Scientific and Technical Information (OSTI)

    Country of Publication: United States Language: English Subject: 74 ATOMIC AND ... PERFORMANCE TESTING; SENSITIVITY; DATA ACQUISITION SYSTEMS; ALKALI METALS; ATOMS Word ...

  2. Using Atom Interferometry to Search for New Forces

    SciTech Connect (OSTI)

    Wacker, Jay G.; /SLAC

    2009-12-11

    Atom interferometry is a rapidly advancing field and this Letter proposes an experiment based on existing technology that can search for new short distance forces. With current technology it is possible to improve the sensitivity by up to a factor of 10{sup 2} and near-future advances will be able to rewrite the limits for forces with ranges from 100 {micro}m to 1km.

  3. Customized atomic force microscopy probe by focused-ion-beam...

    Office of Scientific and Technical Information (OSTI)

    Department of Pediatrics, Division of Immunology, Allergy and Rheumatology, Stanford ... OSTI Identifier: 22314503 Resource Type: Journal Article Resource Relation: Journal Name: ...

  4. Structure and Dynamics of Dinucleosomes Assessed by Atomic Force Microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Filenko, Nina A.; Palets, Dmytro B.; Lyubchenko, Yuri L.

    2012-01-01

    Dynamics of nucleosomes and their interactions are important for understanding the mechanism of chromatin assembly. Internucleosomal interaction is required for the formation of higher-order chromatin structures. Although H1 histone is critically involved in the process of chromatin assembly, direct internucleosomal interactions contribute to this process as well. To characterize the interactions of nucleosomes within the nucleosome array, we designed a dinucleosome and performed direct AFM imaging. The analysis of the AFM data showed dinucleosomes are very dynamic systems, enabling the nucleosomes to move in a broad range along the DNA template. Di-nucleosomes in close proximity were observed, but their populationmore » was low. The use of the zwitterionic detergent, CHAPS, increased the dynamic range of the di-nucleosome, facilitating the formation of tight di-nucleosomes. The role of CHAPS and similar natural products in chromatin structure and dynamics is also discussed.« less

  5. Mode synthesizing atomic force microscopy and mode-synthesizing sensing

    DOE Patents [OSTI]

    Passian, Ali; Thundat, Thomas George; Tetard, Laurene

    2013-05-17

    A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.

  6. Cross-sectional electrostatic force microscopy of thin-film solar cells

    SciTech Connect (OSTI)

    Ballif, C.; Moutinho, H. R.; Al-Jassim, M. M.

    2001-01-15

    In a recent work, we showed that atomic force microscopy (AFM) is a powerful technique to image cross sections of polycrystalline thin films. In this work, we apply a modification of AFM, namely, electrostatic force microscopy (EFM), to investigate the electronic properties of cleaved II--VI and multijunction thin-film solar cells. We cleave the devices in such a way that they are still working with their nominal photovoltaic efficiencies and can be polarized for the measurements. This allows us to differentiate between surface effects (work function and surface band bending) and bulk device properties. In the case of polycrystalline CdTe/CdS/SnO{sub 2}/glass solar cells, we find a drop of the EFM signal in the area of the CdTe/CdS interface ({+-}50 nm). This drop varies in amplitude and sign according to the applied external bias and is compatible with an n-CdS/p-CdTe heterojunction model, thereby invalidating the possibility of a deeply buried n-p CdTe homojunction. In the case of a triple-junction GaInP/GaAs/Ge device, we observe a variation of the EFM signal linked to both the material work-function differences and to the voltage bias applied to the cell. We attempt a qualitative explanation of the results and discuss the implications and difficulties of the EFM technique for the study of such thin-film devices.

  7. Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam F.; Jesse, Stephen; Belianinov, Alex; Somnath, Suhas; Rodriguez, Brian J.; Balke, Nina; Kalinin, Sergei V.

    2016-02-11

    Since its inception over two decades ago, Kelvin probe force microscopy (KPFM) has become the standard technique for characterizing electrostatic, electrochemical and electronic properties at the nanoscale. In this work, we present a purely digital, software-based approach to KPFM utilizing big data acquisition and analysis methods. General Mode (G-Mode) KPFM, works by capturing the entire photodetector data stream, typically at the sampling rate limit, followed by subsequent de-noising, analysis and compression of the cantilever response. We demonstrate that the G-Mode approach allows simultaneous multi-harmonic detection, combined with on-the-fly transfer function correction required for quantitative CPD mapping. The KPFM approach outlinedmore » in this work significantly simplifies the technique by avoiding cumbersome instrumentation optimization steps (i.e. lock in parameters, feedback gains etc.), while also retaining the flexibility to be implemented on any atomic force microscopy platform. We demonstrate the added advantages of G-Mode KPFM by allowing simultaneous mapping of CPD and capacitance gradient (C') channels as well as increased flexibility in data exploration across frequency, time, space, and noise domains. As a result, G-Mode KPFM is particularly suitable for characterizing voltage sensitive materials or for operation in conductive electrolytes, and will be useful for probing electrodynamics in photovoltaics, liquids and ionic conductors.« less

  8. Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

    SciTech Connect (OSTI)

    Evans, J. Chapman, S.

    2014-08-14

    Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided.

  9. Ultra-sensitive Magnetic Microscopy with an Atomic Magnetometer

    SciTech Connect (OSTI)

    Kim, Young Jin

    2015-08-19

    The PowerPoint presentation focused on research goals, specific information about the atomic magnetometer, response and resolution factors of the SERF magnetometer, FC+AM systems, tests of field transfer and resolution on FC, gradient cancellation, testing of AM performance, ideas for a multi-channel AM, including preliminary sensitivity testing, and a description of a 6 channel DAQ system. A few ideas for future work ended the presentation.

  10. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect (OSTI)

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  11. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    SciTech Connect (OSTI)

    Labuda, Aleksander; Proksch, Roger

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  12. Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Balke, Nina; Kalinin, Sergei V.; Jesse, Stephen; Collins, Liam; Belianinov, Alex; Somnath, Suhas

    2016-08-12

    Kelvin probe force microscopy (KPFM) has provided deep insights into the role local electronic, ionic and electrochemical processes play on the global functionality of materials and devices, even down to the atomic scale. Conventional KPFM utilizes heterodyne detection and bias feedback to measure the contact potential difference (CPD) between tip and sample. This measurement paradigm, however, permits only partial recovery of the information encoded in bias- and time-dependent electrostatic interactions between the tip and sample and effectively down-samples the cantilever response to a single measurement of CPD per pixel. This level of detail is insufficient for electroactive materials, devices, ormore » solid-liquid interfaces, where non-linear dielectrics are present or spurious electrostatic events are possible. Here, we simulate and experimentally validate a novel approach for spatially resolved KPFM capable of a full information transfer of the dynamic electric processes occurring between tip and sample. General acquisition mode, or G-Mode, adopts a big data approach utilising high speed detection, compression, and storage of the raw cantilever deflection signal in its entirety at high sampling rates (> 4 MHz), providing a permanent record of the tip trajectory. We develop a range of methodologies for analysing the resultant large multidimensional datasets involving classical, physics-based and information-based approaches. Physics-based analysis of G-Mode KPFM data recovers the parabolic bias dependence of the electrostatic force for each cycle of the excitation voltage, leading to a multidimensional dataset containing spatial and temporal dependence of the CPD and capacitance channels. We use multivariate statistical methods to reduce data volume and separate the complex multidimensional data sets into statistically significant components that can then be mapped onto separate physical mechanisms. Overall, G-Mode KPFM offers a new paradigm to study

  13. High-speed atomic force microscope based on an astigmatic detection system

    SciTech Connect (OSTI)

    Liao, H.-S.; Chen, Y.-H.; Hwu, E.-T.; Chang, C.-S.; Hwang, I.-S.; Ding, R.-F.; Huang, H.-F.; Wang, W.-M.; Huang, K.-Y.

    2014-10-15

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  14. Charge transfer of single laser crystallized intrinsic and phosphorus-doped Si-nanocrystals visualized by Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Xu, Jie; Xu, Jun Lu, Peng; Shan, Dan; Li, Wei; Chen, Kunji

    2014-10-07

    Isolated intrinsic and phosphorus doped (P-doped) Si-nanocrystals (Si-NCs) on n- and p-Si substrates are fabricated by excimer laser crystallization techniques. The formation of Si-NCs is confirmed by atomic force microscopy (AFM) and conductive AFM measurements. Kelvin probe force microscopy (KPFM) is then carried out to visualize the trapped charges in a single Si-NC dot which derives from the charge transfer between Si-NCs and Si substrates due to their different Fermi levels. The laser crystallized P-doped Si-NCs have a similar Fermi level around the mid-gap to the intrinsic counterparts, which might be caused by the inactivated impurity atoms or the surface states-related Fermi level pinning. A clear rise of the Fermi level in P-doped Si-NCs is observed after a short time thermal annealing treatment, indicating the activation of dopants in Si-NCs. Moreover, the surface charge quantity can be estimated using a simple parallel plate capacitor model for a quantitative understanding of the KPFM results at the nanoscale.

  15. Solid-state electrochemistry on the nanometer and atomic scales: the scanning probe microscopy approach

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Strelcov, Evgheni; Yang, Sang Mo; Jesse, Stephen; Balke, Nina; Vasudevan, Rama K.; Kalinin, Sergei V.

    2016-04-21

    Energy technologies of the 21st century require an understanding and precise control over ion transport and electrochemistry at all length scales – from single atoms to macroscopic devices. Our short review provides a summary of recent studies dedicated to methods of advanced scanning probe microscopy for probing electrochemical transformations in solids at the meso-, nano- and atomic scales. In this discussion we present the advantages and limitations of several techniques and a wealth of examples highlighting peculiarities of nanoscale electrochemistry.

  16. Atom probe field ion microscopy and related topics: A bibliography 1990

    SciTech Connect (OSTI)

    Russell, K.F.; Miller, M.K.

    1991-12-01

    This bibliography includes references related to the following topics: atom probe field ion microscopy (APFIM), field ion microscopy (FIM), field emission (FE), ion sources, and field desorption mass microscopy (FDMM). Technique-orientated studies and applications are included. The bibliography covers the period 1990. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references, listed alphabetically by authors, are subdivided into the categories listed in paragraph one above. An Addendum of references missed in previous bibliographies is included.

  17. In Situ Transmission Electron Microscopy

    Office of Scientific and Technical Information (OSTI)

    ... Nanofactory Atomic Force Microscopy (AFM) Stage * Measures force interactions on samples with higher sensitivity than the NanoIndentation stage * Load range between 10 - 2,000 nN * ...

  18. ATOMIC FORCE LITHOGRAPHY OF NANO MICROFLUIDIC CHANNELS FOR VERIFICATION AND MONITORING IN AQUEOUS SOLUTIONS

    SciTech Connect (OSTI)

    Torres, R.; Mendez-Torres, A.; Lam, P.

    2011-06-09

    The growing interest in the physics of fluidic flow in nanoscale channels, as well as the possibility for high sensitive detection of ions and single molecules is driving the development of nanofluidic channels. The enrichment of charged analytes due to electric field-controlled flow and surface charge/dipole interactions along the channel can lead to enhancement of sensitivity and limits-of-detection in sensor instruments. Nuclear material processing, waste remediation, and nuclear non-proliferation applications can greatly benefit from this capability. Atomic force microscopy (AFM) provides a low-cost alternative for the machining of disposable nanochannels. The small AFM tip diameter (< 10 nm) can provide for features at scales restricted in conventional optical and electron-beam lithography. This work presents preliminary results on the fabrication of nano/microfluidic channels on polymer films deposited on quartz substrates by AFM lithography.

  19. ATOMIC FORCE LITHOGRAPHY OF NANO/MICROFLUIDIC CHANNELS FOR VERIFICATION AND MONITORING OF AQUEOUS SOLUTIONS

    SciTech Connect (OSTI)

    Mendez-Torres, A.; Torres, R.; Lam, P.

    2011-07-15

    The growing interest in the physics of fluidic flow in nanoscale channels, as well as the possibility for high sensitive detection of ions and single molecules is driving the development of nanofluidic channels. The enrichment of charged analytes due to electric field-controlled flow and surface charge/dipole interactions along the channel can lead to enhancement of sensitivity and limits-of-detection in sensor instruments. Nuclear material processing, waste remediation, and nuclear non-proliferation applications can greatly benefit from this capability. Atomic force microscopy (AFM) provides a low-cost alternative for the machining of disposable nanochannels. The small AFM tip diameter (< 10 nm) can provide for features at scales restricted in conventional optical and electron-beam lithography. This work presents preliminary results on the fabrication of nano/microfluidic channels on polymer films deposited on quartz substrates by AFM lithography.

  20. A metrological large range atomic force microscope with improved performance

    SciTech Connect (OSTI)

    Dai, Gaoliang; Wolff, Helmut; Pohlenz, Frank; Danzebrink, Hans-Ulrich

    2009-04-15

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument.

  1. Free vibrations of U-shaped atomic force microscope probes

    SciTech Connect (OSTI)

    Rezaei, E.; Turner, J. A.

    2014-05-07

    Contact resonance atomic force microscope (AFM) methods have been used to quantify the elastic and viscoelastic properties of a variety of materials such as polymers, ceramics, biological materials, and metals with spatial resolution on the order of tens of nanometers. This approach involves measurement of the resonant frequencies of the AFM probe both for the free case and the case for which the tip is in contact with a sample. Vibration models of the probe and tip-sample contact models are then used to determine the sample properties from the frequency behavior and to create images of the sample properties. This work has been primarily focused on rectangular, single-beam probes for which the vibration models are relatively simple. Recently, U-shaped AFM probes have been developed to allow local heating of samples and the resonances of these probes are much more complex. In this article, a simplified analytical model of these U-shaped probes is described. This three beam model includes two beams clamped at one end and connected with a perpendicular cross beam at the other end. The beams are assumed only to bend in flexure and twist but their coupling allows a wide range of possible dynamic behavior. Results are presented for the first ten modes and the mode shapes are shown to have complex coupling between the flexure and twisting of the beams, particularly for the higher modes. All resonant frequency results are in good agreement with finite element results for the three probe designs and two values of thickness considered (all wavenumbers are within 3.0%). This work is anticipated to allow U-shaped probes to be used eventually for quantitative measurements of sample material properties during heating using a contact resonance approach.

  2. Transient dynamics in magnetic force microscopy for a single-spin measurement

    SciTech Connect (OSTI)

    Berman, G.P.; Borgonovi, F.; Lopez, G.V.; Tsifrinovich, V.I.

    2003-07-01

    We analyze a single-spin measurement using a transient process in magnetic force microscopy which could increase the maximum operating temperature by a factor of Q (the quality factor of the cantilever) in comparison with the static Stern-Gerlach effect. We obtain an exact solution of the master equation, which confirms this result. We also discuss the conditions required to create a macroscopic quantum superposition in the cantilever.

  3. Electric contributions to magnetic force microscopy response from graphene and MoS{sub 2} nanosheets

    SciTech Connect (OSTI)

    Li, Lu Hua Chen, Ying

    2014-12-07

    Magnetic force microscopy (MFM) signals have recently been detected from whole pieces of mechanically exfoliated graphene and molybdenum disulfide (MoS{sub 2}) nanosheets, and magnetism of the two nanomaterials was claimed based on these observations. However, non-magnetic interactions or artefacts are commonly associated with MFM signals, which make the interpretation of MFM signals not straightforward. A systematic investigation has been done to examine possible sources of the MFM signals from graphene and MoS{sub 2} nanosheets and whether the MFM signals can be correlated with magnetism. It is found that the MFM signals have significant non-magnetic contributions due to capacitive and electrostatic interactions between the nanosheets and conductive cantilever tip, as demonstrated by electric force microscopy and scanning Kevin probe microscopy analyses. In addition, the MFM signals of graphene and MoS{sub 2} nanosheets are not responsive to reversed magnetic field of the magnetic cantilever tip. Therefore, the observed MFM response is mainly from electric artefacts and not compelling enough to correlate with magnetism of graphene and MoS{sub 2} nanosheets.

  4. Spatial dependence of polycrystalline FTOs conductance analyzed by conductive atomic force microscope (C-AFM)

    SciTech Connect (OSTI)

    Peixoto, Alexandre Pessoa; Costa, J. C. da

    2014-05-15

    Fluorine-doped Tin oxide (FTO) is a highly transparent, electrically conductive polycrystalline material frequently used as an electrode in organic solar cells and optical-electronic devices [12]. In this work a spatial analysis of the conductive behavior of FTO was carried out by Conductive-mode Atomic Force Microscopy (C-AFM). Rare highly oriented grains sample give us an opportunity to analyze the top portion of polycrystalline FTO and compare with the border one. It is shown that the current flow essentially takes place through the polycrystalline edge at grain boundaries.

  5. Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Mazet, Lucie; Jesse, Stephen; Niu, Gang; Schroeder, Thomas; Schamm-Chardon, Sylvie; Dubourdieu, Catherine; Baddorf, Arthur P.; Kalinin, Sergei V.; Yang, Sang Mo; Okatan, M. Baris

    2016-06-20

    Here, all scanning probe microscopies are subjected to topographic cross-talk, meaning the topography-related contrast in functional images. Here, we investigate the signatures of indirect topographic cross-talk in piezoresponse force microscopy (PFM) imaging and spectroscopy and its decoupling using band excitation (BE) method in ferroelectric BaTiO3 deposited on the Si substrates with free standing nanopillars of diameter 50 nm. Comparison between the single-frequency PFM and BE-PFM results shows that the measured signal can be significantly distorted by topography-induced shifts in the contact resonance frequency and cantilever transfer function. However, with proper correction, such shifts do not affect PFM imaging and hysteresismore » loop measurements. This suggests the necessity of an advanced approach, such as BE-PFM, for detection of intrinsic sample piezoresponse on the topographically non-uniform surfaces.« less

  6. Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits

    DOE Patents [OSTI]

    Campbell, Ann. N.; Anderson, Richard E.; Cole, Jr., Edward I.

    1995-01-01

    A magnetic force microscopy method and improved magnetic tip for detecting and quantifying internal magnetic fields resulting from current of integrated circuits. Detection of the current is used for failure analysis, design verification, and model validation. The interaction of the current on the integrated chip with a magnetic field can be detected using a cantilevered magnetic tip. Enhanced sensitivity for both ac and dc current and voltage detection is achieved with voltage by an ac coupling or a heterodyne technique. The techniques can be used to extract information from analog circuits.

  7. Magnetic force microscopy method and apparatus to detect and image currents in integrated circuits

    DOE Patents [OSTI]

    Campbell, A.N.; Anderson, R.E.; Cole, E.I. Jr.

    1995-11-07

    A magnetic force microscopy method and improved magnetic tip for detecting and quantifying internal magnetic fields resulting from current of integrated circuits are disclosed. Detection of the current is used for failure analysis, design verification, and model validation. The interaction of the current on the integrated chip with a magnetic field can be detected using a cantilevered magnetic tip. Enhanced sensitivity for both ac and dc current and voltage detection is achieved with voltage by an ac coupling or a heterodyne technique. The techniques can be used to extract information from analog circuits. 17 figs.

  8. Atomic-scale electrochemistry on the surface of a manganite by scanning tunneling microscopy

    SciTech Connect (OSTI)

    Vasudevan, Rama K. Tselev, Alexander; Baddorf, Arthur P.; Gianfrancesco, Anthony G.

    2015-04-06

    The doped manganese oxides (manganites) have been widely studied for their colossal magnetoresistive effects, for potential applications in oxide spintronics, electroforming in resistive switching devices, and are materials of choice as cathodes in modern solid oxide fuel cells. However, little experimental knowledge of the dynamics of the surfaces of perovskite manganites at the atomic scale exists. Here, through in-situ scanning tunneling microscopy (STM), we demonstrate atomic resolution on samples of La{sub 0.625}Ca{sub 0.375}MnO{sub 3} grown on (001) SrTiO{sub 3} by pulsed laser deposition. Furthermore, by applying triangular DC waveforms of increasing amplitude to the STM tip, and measuring the tunneling current, we demonstrate the ability to both perform and monitor surface electrochemical processes at the atomic level, including formation of oxygen vacancies and removal and deposition of individual atomic units or clusters. Our work paves the way for better understanding of surface oxygen reactions in these systems.

  9. Inter-atomic force constants of BaF{sub 2} by diffuse neutron scattering measurement

    SciTech Connect (OSTI)

    Sakuma, Takashi Makhsun,; Sakai, Ryutaro; Xianglian; Takahashi, Haruyuki; Basar, Khairul; Igawa, Naoki; Danilkin, Sergey A.

    2015-04-16

    Diffuse neutron scattering measurement on BaF{sub 2} crystals was performed at 10?K and 295?K. Oscillatory form in the diffuse scattering intensity of BaF{sub 2} was observed at 295?K. The correlation effects among thermal displacements of F-F atoms were obtained from the analysis of oscillatory diffuse scattering intensity. The force constants among neighboring atoms in BaF{sub 2} were determined and compared to those in ionic crystals and semiconductors.

  10. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    DOE Patents [OSTI]

    Fink, Samuel D.; Fondeur, Fernando F.

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  11. Identifying ferroelectric phase and domain structure using angle-resolved piezoresponse force microscopy

    SciTech Connect (OSTI)

    Kim, K. L.; Huber, J. E.

    2014-03-24

    We used angle-resolved piezoresponse force microscopy (AR-PFM), vertical PFM (VPFM), and electron backscatter diffraction (EBSD) to provide a systematic interpretation of domain patterns in polycrystalline, near-morphotropic lead zirconate titanate. This material was used to illustrate the power of AR-PFM methods in resolving complex domain patterns where multiple phases may be present. AR-PFM was carried out with a 30° rotation interval, and the resulting data were analysed to identify the orientation of the underlying axis of piezoelectricity. The additional information provided by AR-PFM was studied, comparing its capabilities to those of 3-dimensional PFM, consisting of one VPFM image and two orthogonal lateral PFM (LPFM) images. We show that, in certain conditions, using AR-PFM can identify the phases present at the sub-grain scale. This was confirmed using VPFM and EBSD data. Furthermore, the method can discriminate laminated domain patterns that appear similar in VPFM and can reliably expose domain patterns that may not be seen in LPFM data from a single orientation, or even in 3D PFM data.

  12. G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam; Belianinov, Alex; Proksch, Roger; Zuo, Tingting; Zhang, Yong; Liaw, Peter K.; Kalinin, Sergei V.; Jesse, Stephen

    2016-05-09

    We develop a full information capture approach for Magnetic Force Microscopy (MFM), referred to as generalized mode (G-Mode) MFM. G-Mode MFM acquires and stores the full data stream from the photodetector at sampling rates approaching the intrinsic photodiode limit. The data can be subsequently compressed, denoised, and analyzed, without information loss. Also, 3 G-Mode MFM is implemented and compared to traditional heterodyne based MFM on model systems including domain structures in ferromagnetic Yttrium Iron Garnet (YIG) and electronically and magnetically inhomogeneous high entropy alloy, CoFeMnNiSn. We investigate the use of information theory to mine the G-Mode MFM data and demonstratemore » its usefulness for extracting information which may be hidden in traditional MFM modes, including signatures of nonlinearities and mode coupling phenomena. Finally we demonstrate detection and separation of magnetic and electrostatic tip-sample interactions from a single G-Mode image, by analyzing the entire frequency response of the cantilever. G-Mode MFM is immediately implementable on any AFM platform and as such is expected to be a useful technique for probing spatiotemporal cantilever dynamics and mapping material properties as well as their mutual interactions.« less

  13. Gaussian approximation and single-spin measurement in magnetic resonance force microscopy with spin noise

    SciTech Connect (OSTI)

    Raghunathan, Shesha; Brun, Todd A.; Goan, Hsi-Sheng

    2010-11-15

    A promising technique for measuring single electron spins is magnetic resonance force microscopy (MRFM), in which a microcantilever with a permanent magnetic tip is resonantly driven by a single oscillating spin. The most effective experimental technique is the oscillating cantilever-driven adiabatic reversals (OSCAR) protocol, in which the signal takes the form of a frequency shift. If the quality factor of the cantilever is high enough, this signal will be amplified over time to the point where it can be detected by optical or other techniques. An important requirement, however, is that this measurement process occurs on a time scale that is short compared to any noise which disturbs the orientation of the measured spin. We describe a model of spin noise for the MRFM system and show how this noise is transformed to become time dependent in going to the usual rotating frame. We simplify the description of the cantilever-spin system by approximating the cantilever wave function as a Gaussian wave packet and show that the resulting approximation closely matches the full quantum behavior. We then examine the problem of detecting the signal for a cantilever with thermal noise and spin with spin noise, deriving a condition for this to be a useful measurement.

  14. Piezoelectricity and ferroelectricity of cellular polypropylene electrets films characterized by piezoresponse force microscopy

    SciTech Connect (OSTI)

    Miao, Hongchen; Sun, Yao; Zhou, Xilong; Li, Yingwei; Li, Faxin

    2014-08-14

    Cellular electrets polymer is a new ferroelectret material exhibiting large piezoelectricity and has attracted considerable attentions in researches and industries. Property characterization is very important for this material and current investigations are mostly on macroscopic properties. In this work, we conduct nanoscale piezoelectric and ferroelectric characterizations of cellular polypropylene (PP) films using piezoresponse force microscopy (PFM). First, both the single-frequency PFM and dual-frequency resonance-tracking PFM testings were conducted on the cellular PP film. The localized piezoelectric constant d{sub 33} is estimated to be 7–11pC/N by correcting the resonance magnification with quality factor and it is about one order lower than the macroscopic value. Next, using the switching spectroscopy PFM (SS-PFM), we studied polarization switching behavior of the cellular PP films. Results show that it exhibits the typical ferroelectric-like phase hysteresis loops and butterfly-shaped amplitude loops, which is similar to that of a poly(vinylidene fluoride) (PVDF) ferroelectric polymer film. However, both the phase and amplitude loops of the PP film are intensively asymmetric, which is thought to be caused by the nonzero remnant polarization after poling. Then, the D-E hysteresis loops of both the cellular PP film and PVDF film were measured by using the same wave form as that used in the SS-PFM, and the results show significant differences. Finally, we suggest that the ferroelectric-like behavior of cellular electrets films should be distinguished from that of typical ferroelectrics, both macroscopically and microscopically.

  15. Structural evolution and strain induced mixing in Cu–Co composites studied by transmission electron microscopy and atom probe tomography

    SciTech Connect (OSTI)

    Bachmaier, A.; Aboulfadl, H.; Pfaff, M.; Mücklich, F.; Motz, C.

    2015-02-15

    A Cu–Co composite material is chosen as a model system to study structural evolution and phase formations during severe plastic deformation. The evolving microstructures as a function of the applied strain were characterized at the micro-, nano-, and atomic scale-levels by combining scanning electron microscopy and transmission electron microscopy including energy-filtered transmission electron microscopy and electron energy-loss spectroscopy. The amount of intermixing between the two phases at different strains was examined at the atomic scale using atom probe tomography as complimentary method. It is shown that Co particles are dissolved in the Cu matrix during severe plastic deformation to a remarkable extent and their size, number, and volume fraction were quantitatively determined during the deformation process. From the results, it can be concluded that supersaturated solid solutions up to 26 at.% Co in a fcc Cu–26 at.% Co alloy are obtained during deformation. However, the distribution of Co was found to be inhomogeneous even at the highest degree of investigated strain. - Highlights: • Structural evolution in a deformed Cu–Co composite is studied on all length scales. • Amount of intermixing is examined by atom-probe tomography. • Supersaturated solid solutions up to 26 at.% Co in Cu are observed.

  16. Atomic arrangement at ZnTe/CdSe interfaces determined by high resolution scanning transmission electron microscopy and atom probe tomography

    SciTech Connect (OSTI)

    Bonef, Bastien; Rouvire, Jean-Luc; Jouneau, Pierre-Henri; Bellet-Amalric, Edith; Grard, Lionel; Mariette, Henri; Andr, Rgis; Bougerol, Catherine; Grenier, Adeline

    2015-02-02

    High resolution scanning transmission electron microscopy and atom probe tomography experiments reveal the presence of an intermediate layer at the interface between two binary compounds with no common atom, namely, ZnTe and CdSe for samples grown by Molecular Beam Epitaxy under standard conditions. This thin transition layer, of the order of 1 to 3 atomic planes, contains typically one monolayer of ZnSe. Even if it occurs at each interface, the direct interface, i.e., ZnTe on CdSe, is sharper than the reverse one, where the ZnSe layer is likely surrounded by alloyed layers. On the other hand, a CdTe-like interface was never observed. This interface knowledge is crucial to properly design superlattices for optoelectronic applications and to master band-gap engineering.

  17. Growth analysis of cadmium sulfide thin films by atomic force microscopy

    SciTech Connect (OSTI)

    Moutinho, H.R.; Dhere, R.G.; Ramanathan, K.

    1996-05-01

    CdS films have been deposited by solution growth on SnO{sub 2} and glass substrates. Nucleation on SnO{sub 2} occurs at early deposition times, and complete conformal coverage is observed at low thickness values. The average grain size of the CdS films is established at these early times. In films deposited on glass substrates, nucleation is slower and occurs through 3-dimensional islands that increase in size and number as deposition proceeds. Optical measurements show that the bandgap values of CdS films deposited on SnO{sub 2} depend mainly on substrate structure. Hydrogen heat treatment does not affect the surface morphology of the samples, but decreases bandgap values.

  18. Mode-synthesizing atomic force microscopy and mode-synthesizing sensing

    DOE Patents [OSTI]

    Passain, Ali; Thundat, Thomas George; Tetard, Laurene

    2014-07-22

    A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.

  19. Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy

    DOE Patents [OSTI]

    Kazmerski, Lawrence L.

    1990-01-01

    A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

  20. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun; Ogletree, D. Frank; Salmeron, Miguel; Xiao, Xudong

    1999-01-01

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  1. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

    1999-03-09

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

  2. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

    1998-04-28

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

  3. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun; Ogletree, D. Frank; Salmeron, Miguel; Xiao, Xudong

    1998-01-01

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  4. Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

    SciTech Connect (OSTI)

    Torun, H.; Torello, D.; Degertekin, F. L.

    2011-08-15

    The authors describe a method of actuation for atomic force microscope (AFM) probes to improve imaging speed and displacement range simultaneously. Unlike conventional piezoelectric tube actuation, the proposed method involves a lever and fulcrum ''seesaw'' like actuation mechanism that uses a small, fast piezoelectric transducer. The lever arm of the seesaw mechanism increases the apparent displacement range by an adjustable gain factor, overcoming the standard tradeoff between imaging speed and displacement range. Experimental characterization of a cantilever holder implementing the method is provided together with comparative line scans obtained with contact mode imaging. An imaging bandwidth of 30 kHz in air with the current setup was demonstrated.

  5. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect (OSTI)

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanners fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the ?{sub 3}?{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ?7 frames/s.

  6. Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope

    SciTech Connect (OSTI)

    Kuwahara, Masashi; Abe, Hidekazu; Tokumoto, Hiroshi; Shima, Takayuki; Tominaga, Junji; Fukuda, Hajime

    2004-03-15

    A carbon nanotube (CNT) was successfully attached to a base probe with a blunt apex and subsequently used as a probe for an atomic force microscope (AFM). This setup demonstrates high spatial resolution properties, plus an advantage: we were able to readily identify the loss of the CNT from the end of the probe by the resultant sudden drop in resolution. This design of probe is expected to feature yet another advantage: that of relative immunity to accidental collision compared to a CNT attached to a commercially available sharp tip. We also discuss the problems specific to CNT-attached probes, which are carbon contamination of the sample surface and artifact images formed at the edge of pit structures. We demonstrate that carbon contamination can be suppressed by a rubbing procedure before the scanning use, and that pit artifacts can be eliminated by optimizing the CNT length.

  7. Note: Calibration of atomic force microscope cantilevers using only their resonant frequency and quality factor

    SciTech Connect (OSTI)

    Sader, John E.; Friend, James R.

    2014-11-15

    A simplified method for calibrating atomic force microscope cantilevers was recently proposed by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012); Sec. III D] that relies solely on the resonant frequency and quality factor of the cantilever in fluid (typically air). This method eliminates the need to measure the hydrodynamic function of the cantilever, which can be time consuming given the wide range of cantilevers now available. Using laser Doppler vibrometry, we rigorously assess the accuracy of this method for a series of commercially available cantilevers and explore its performance under non-ideal conditions. This shows that the simplified method is highly accurate and can be easily implemented to perform fast, robust, and non-invasive spring constant calibration.

  8. Understanding Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic Resolution Electron Microscopy and Field Evaporation Simulation

    SciTech Connect (OSTI)

    Devaraj, Arun; Colby, Robert J.; Vurpillot, F.; Thevuthasan, Suntharampillai

    2014-03-26

    Metal-dielectric composite materials, specifically metal nanoparticles supported on or embedded in metal oxides, are widely used in catalysis. The accurate optimization of such nanostructures warrants the need for detailed three-dimensional characterization. Atom probe tomography is uniquely capable of generating sub-nanometer structural and compositional data with part-per-million mass sensitivity, but there are reconstruction artifacts for composites containing materials with strongly differing fields of evaporation, as for oxide-supported metal nanoparticles. By correlating atom probe tomography with scanning transmission electron microscopy for Au nanoparticles embedded in an MgO support, deviations from an ideal topography during evaporation are demonstrated directly, and correlated with compositional errors in the reconstructed data. Finite element simulations of the field evaporation process confirm that protruding Au nanoparticles will evolve on the tip surface, and that evaporation field variations lead to an inaccurate assessment of the local composition, effectively lowering the spatial resolution of the final reconstructed dataset. Cross-correlating the experimental data with simulations results in a more detailed understanding of local evaporation aberrations during APT analysis of metal-oxide composites, paving the way towards a more accurate three-dimensional characterization of this technologically important class of materials.

  9. Micro- and nanodomain imaging in uniaxial ferroelectrics: Joint application of optical, confocal Raman, and piezoelectric force microscopy

    SciTech Connect (OSTI)

    Shur, V. Ya. Zelenovskiy, P. S.

    2014-08-14

    The application of the most effective methods of the domain visualization in model uniaxial ferroelectrics of lithium niobate (LN) and lithium tantalate (LT) family, and relaxor strontium-barium niobate (SBN) have been reviewed in this paper. We have demonstrated the synergetic effect of joint usage of optical, confocal Raman, and piezoelectric force microscopies which provide extracting of the unique information about formation of the micro- and nanodomain structures. The methods have been applied for investigation of various types of domain structures with increasing complexity: (1) periodical domain structure in LN and LT, (2) nanodomain structures in LN, LT, and SBN, (3) nanodomain structures in LN with modified surface layer, (4) dendrite domain structure in LN. The self-assembled appearance of quasi-regular nanodomain structures in highly non-equilibrium switching conditions has been considered.

  10. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images

    SciTech Connect (OSTI)

    Gonnissen, J.; De Backer, A.; Martinez, G. T.; Van Aert, S.; Dekker, A. J. den; Rosenauer, A.; Sijbers, J.

    2014-08-11

    We report an innovative method to explore the optimal experimental settings to detect light atoms from scanning transmission electron microscopy (STEM) images. Since light elements play a key role in many technologically important materials, such as lithium-battery devices or hydrogen storage applications, much effort has been made to optimize the STEM technique in order to detect light elements. Therefore, classical performance criteria, such as contrast or signal-to-noise ratio, are often discussed hereby aiming at improvements of the direct visual interpretability. However, when images are interpreted quantitatively, one needs an alternative criterion, which we derive based on statistical detection theory. Using realistic simulations of technologically important materials, we demonstrate the benefits of the proposed method and compare the results with existing approaches.

  11. In situ atomic force microscope study of high-temperature untwinning surface relief in Mn-Fe-Cu antiferromagnetic shape memory alloy

    SciTech Connect (OSTI)

    Wang, L.; Cui, Y. G.; Wan, J. F.; Rong, Y. H.; Zhang, J. H.; Jin, X.; Cai, M. M.

    2013-05-06

    The N-type untwinning surface relief associated with the fcc {r_reversible} fct martensitic transformation (MT) was observed in the Mn{sub 81.5}Fe{sub 14.0}Cu{sub 4.5} antiferromagnetic high-temperature shape memory alloy (SMA) by in situ atomic force microscopy. The measured untwinning relief angles ({theta}{sub {alpha}} Double-Vertical-Line {theta}{sub {beta}}) at the ridge and at the valley were different, and both angles were less than the conventional values. The surface relief exhibited good reversibility during heating and cooling because of the crystallographic reversibility of thermal-elastic SMAs. Untwinning shear was proposed as the main mechanism of the N-type surface relief. The order of the reverse MT was discussed based on the experimental measurements.

  12. Directly correlated transmission electron microscopy and atom probe tomography of grain boundary oxidation in a Ni-Al binary alloy exposed to high-temperature water.

    SciTech Connect (OSTI)

    Schreiber, Daniel K.; Olszta, Matthew J.; Bruemmer, Stephen M.

    2013-10-30

    Intergranular oxidation of a Ni-4Al alloy exposed to hydrogenated, high-temperature water was characterized using directly correlated transmission electron microscopy and atom probe tomography. These combined analyses revealed that discrete, well-separated oxides (NiAl2O4) precipitated along grain boundaries in the metal. Aluminum was depleted from the grain boundary between oxides and also from one side of the boundary as a result of grain boundary migration. The discrete oxide morphology, disconnected from the continuous surface oxidation, suggests intergranular solid-state internal oxidation of Al. Keywords: oxidation; grain boundaries; nickel alloys; atom probe tomography; transmission electron microscopy (TEM)

  13. Sensing Current and Forces with SPM

    SciTech Connect (OSTI)

    Park, Jeong Y.; Maier, Sabine; Hendriksen, Bas; Salmeron, Miquel

    2010-07-02

    Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces during STM and the detection of currents during AFM can give valuable additional information of the nanoscale material properties.

  14. Atomic-resolution study of polarity reversal in GaSb grown on Si by scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Hosseini Vajargah, S.; Woo, S. Y.; Botton, G. A.; Ghanad-Tavakoli, S.; Kleiman, R. N.; Preston, J. S.

    2012-11-01

    The atomic-resolved reversal of the polarity across an antiphase boundary (APB) was observed in GaSb films grown on Si by high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). The investigation of the interface structure at the origin of the APB reveals that coalescence of two domains with Ga-prelayer and Sb-prelayer causes the sublattice reversal. The local strain and lattice rotation distributions of the APB, attributed to the discordant bonding length at the APB with the surrounding GaSb lattice, were further studied using the geometric phase analysis technique. The crystallographic characteristics of the APBs and their interaction with other planar defects were observed with HAADF-STEM. The quantitative agreement between experimental and simulated images confirms the observed polarities in the acquired HAADF-STEM data. The self-annihilation mechanism of the APBs is addressed based on the rotation induced by anti-site bonds and APBs' faceting.

  15. Isolating and moving single atoms using silicon nanocrystals

    DOE Patents [OSTI]

    Carroll, Malcolm S.

    2010-09-07

    A method is disclosed for isolating single atoms of an atomic species of interest by locating the atoms within silicon nanocrystals. This can be done by implanting, on the average, a single atom of the atomic species of interest into each nanocrystal, and then measuring an electrical charge distribution on the nanocrystals with scanning capacitance microscopy (SCM) or electrostatic force microscopy (EFM) to identify and select those nanocrystals having exactly one atom of the atomic species of interest therein. The nanocrystals with the single atom of the atomic species of interest therein can be sorted and moved using an atomic force microscope (AFM) tip. The method is useful for forming nanoscale electronic and optical devices including quantum computers and single-photon light sources.

  16. Photo-thermal quartz tuning fork excitation for dynamic mode atomic force microscope

    SciTech Connect (OSTI)

    Bontempi, Alexia; Teyssieux, Damien; Thiery, Laurent; Hermelin, Damien; Vairac, Pascal; Friedt, Jean-Michel

    2014-10-13

    A photo-thermal excitation of a Quartz Tuning Fork (QTF) for topographic studies is introduced. The non-invasive photo-thermal excitation presents practical advantages compared to QTF mechanical and electrical excitations, including the absence of the anti-resonance and its associated phase rotation. Comparison between our theoretical model and experiments validate that the optical transduction mechanism is a photo-thermal rather than photo-thermoacoustic phenomenon. Topographic maps in the context of near-field microscopy distance control have been achieved to demonstrate the performance of the system.

  17. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    SciTech Connect (OSTI)

    Karc?, zgr; Dede, Mnir

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ~12 fm/?Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  18. Nanoscale characterization of β-phase H{sub x}Li{sub 1−x}NbO{sub 3} layers by piezoresponse force microscopy

    SciTech Connect (OSTI)

    Manzo, Michele; Gallo, Katia; Denning, Denise; Rodriguez, Brian J.

    2014-08-14

    We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO{sub 3} with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d{sub 33} coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO{sub 3} value, for undoped and 5 mol. % MgO-doped substrates, respectively.

  19. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope

    SciTech Connect (OSTI)

    Sader, John E.; Lu, Jianing; Mulvaney, Paul

    2014-11-15

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  20. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties

    SciTech Connect (OSTI)

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-15

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  1. The structures and dynamics of atomic and molecular adsorbates on metal surfaces by scanning tunneling microscopy and low energy electron diffraction

    SciTech Connect (OSTI)

    Yoon, Hyungsuk Alexander

    1996-12-01

    Studies of surface structure and dynamics of atoms and molecules on metal surfaces are presented. My research has focused on understanding the nature of adsorbate-adsorbate and adsorbate-substrate interactions through surface studies of coverage dependency and coadsorption using both scanning tunneling microscopy (STM) and low energy electron diffraction (LEED). The effect of adsorbate coverage on the surface structures of sulfur on Pt(111) and Rh(111) was examined. On Pt(111), sulfur forms p(2x2) at 0.25 ML of sulfur, which transforms into a more compressed ({radical}3x{radical}3)R30{degrees} at 0.33 ML. On both structures, it was found that sulfur adsorbs only in fcc sites. When the coverage of sulfur exceeds 0.33 ML, it formed more complex c({radical}3x7)rect structure with 3 sulfur atoms per unit cell. In this structure, two different adsorption sites for sulfur atoms were observed - two on fcc sites and one on hcp site within the unit cell.

  2. Effect of homolog doping on surface morphology and mass-loss rates from PETN crystals. Studies using atomic force microscope and thermo-gravimetric analysis

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Bhattacharya, S. K.; Maiti, A; Gee, R. H.; Nunley, J.; Weeks, B. L.

    2012-08-28

    Pentaerythritol tetranitrate (PETN) is an important energetic material and its performance as a secondary explosive depends strongly on the density as well as flow porosity of powdered material, which in turn is governed by the size and surface properties of the PETN crystallite particles. Historically there has been evidence that the surface properties of PETN particles can be strongly influenced by the presence of homolog impurities of PETN, in particular, dipentaerythritol hexanitrate (diPEHN) and tripentaerythritol octanitrate (triPEON), although not many systematic studies characterizing such influence exist. In this work we employ thermogravimetric analysis (TGA) to measure mass-loss rates at elevatedmore » temperatures and show that doping with a small amount of diPEHN and triPEON can reduce the mass-loss rate from PETN single-crystal surfaces by as much as 35 % as compared to undoped crystals. Arrhenius plots of mass-loss rates as a function of temperature suggest that the reduction in evaporation is not due to the change in activation barrier of the molecular evaporation process, but perhaps due to the impedance to the receding motion of the steps by the immobile impurities on the surface. Removal of surface impurities through gentle washing with ethanol leads to enhanced mass-loss rate relative to pure PETN suggesting a roughened surface morphology. Some surface roughening in doped crystals is supported by Atomic force microscopy (AFM) images of growth layers that show evidences of growth layer stacking and rough edges. Furthermore, we find that a larger amount of impurity added to the original solution does not necessarily lead to a more highly doped crystal, which could perhaps be interpreted as PETN crystals being able to accommodate only up to a certain weight percent of homolog impurities.« less

  3. Imaging individual lanthanum atoms in zeolite Y by scanning transmission electron microscopy: evidence of lanthanum pair sites

    SciTech Connect (OSTI)

    Xu, Pinghong; Lu, Jing; Aydin, C.; Debefve, Louise M.; Browning, Nigel D.; Chen, Cong-Yan; Gates, Bruce C.

    2015-09-01

    Images of La-exchanged NaY zeolite obtained with aberration-corrected scanning transmission electron microscopy (STEM) show that about 80% of the La cations were present as site-isolated species, with the remainder in pair sites. The distance between La cations in the pair sites ranged from 1.44 to 3.84 Å, consistent with the presence of pairs of cations tilted at various angles with respect to the support surface. The actual distance between La cations in the pair sites is inferred to be approximately 3.84 Å, which is shorter than the distance between the nearest Al sites in the zeolite (4.31 Å). The results therefore suggest the presence of dimeric structures of La cations bridged with OH groups, and the presence of such species has been inferred previously on the basis of X-ray photoelectron spectroscopy (W. Grünert, U. Sauerlandt, R. Schlögl, H.G. Karge, J. Phys. Chem., 97 (1993) 1413).

  4. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

    SciTech Connect (OSTI)

    Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; Lange, Dorus de; Sadeghian, Hamed E-mail: h.sadeghianmarnani@tudelft.nl

    2015-11-15

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

  5. Potential variation around grain boundaries in BaSi{sub 2} films grown on multicrystalline silicon evaluated using Kelvin probe force microscopy

    SciTech Connect (OSTI)

    Baba, Masakazu; Tsukahara, Daichi; Toko, Kaoru; Hara, Kosuke O.; Usami, Noritaka; Sekiguchi, Takashi; Suemasu, Takashi

    2014-12-21

    Potential variations across the grain boundaries (GBs) in a 100?nm thick undoped n-BaSi{sub 2} film on a cast-grown multicrystalline Si (mc-Si) substrate are evaluated using Kelvin probe force microscopy (KFM). The ?-2? X-ray diffraction pattern reveals diffraction peaks, such as (201), (301), (410), and (411) of BaSi{sub 2}. Local-area electron backscatter diffraction reveals that the a-axis of BaSi{sub 2} is tilted slightly from the surface normal, depending on the local crystal plane of the mc-Si. KFM measurements show that the potentials are not significantly disordered in the grown BaSi{sub 2}, even around the GBs of mc-Si. The potentials are higher at GBs of BaSi{sub 2} around Si GBs that are formed by grains with a Si(111) face and those with faces that deviate slightly from Si(111). Thus, downward band bending occurs at these BaSi{sub 2} GBs. Minority carriers (holes) undergo a repelling force near the GBs, which may suppress recombination as in the case of undoped n-BaSi{sub 2} epitaxial films on a single crystal Si(111) substrate. The barrier height for hole transport across the GBs varies in the range from 10 to 55?meV. The potentials are also higher at the BaSi{sub 2} GBs grown around Si GBs composed of grains with Si(001) and Si(111) faces. The barrier height for hole transport ranges from 5 to 55?meV. These results indicate that BaSi{sub 2} GBs formed on (111)-dominant Si surfaces do not have a negative influence on the minority-carrier properties, and thus BaSi{sub 2} formed on underlayers, such as (111)-oriented Si or Ge and on (111)-oriented mc-Si, can be utilized as a solar cell active layer.

  6. Probing graphene defects and estimating graphene quality with optical microscopy

    SciTech Connect (OSTI)

    Lai, Shen; Kyu Jang, Sung; Jae Song, Young; Lee, Sungjoo

    2014-01-27

    We report a simple and accurate method for detecting graphene defects that utilizes the mild, dry annealing of graphene/Cu films in air. In contrast to previously reported techniques, our simple approach with optical microscopy can determine the density and degree of dislocation of defects in a graphene film without inducing water-related damage or functionalization. Scanning electron microscopy, confocal Raman and atomic force microscopy, and X-ray photoelectron spectroscopy analysis were performed to demonstrate that our nondestructive approach to characterizing graphene defects with optimized thermal annealing provides rapid and comprehensive determinations of graphene quality.

  7. Scanning Probe Microscopy with Spectroscopic Molecular Recognition - Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Innovation Portal Scanning Probe Microscopy with Spectroscopic Molecular Recognition Oak Ridge National Laboratory Contact ORNL About This Technology Technology Marketing SummaryORNL researchers developed an innovative imaging method that possesses the imaging capability of scanning near-field ultrasound holography and the chemical specificity of reverse photoacoustic spectroscopy. This imaging method can achieve chemical differentiation with nanometer resolution. DescriptionAtomic force

  8. Uncertainty in least-squares fits to the thermal noise spectra of nanomechanical resonators with applications to the atomic force microscope

    SciTech Connect (OSTI)

    Sader, John E.; Yousefi, Morteza; Friend, James R.; Melbourne Centre for Nanofabrication, Clayton, Victoria 3800

    2014-02-15

    Thermal noise spectra of nanomechanical resonators are used widely to characterize their physical properties. These spectra typically exhibit a Lorentzian response, with additional white noise due to extraneous processes. Least-squares fits of these measurements enable extraction of key parameters of the resonator, including its resonant frequency, quality factor, and stiffness. Here, we present general formulas for the uncertainties in these fit parameters due to sampling noise inherent in all thermal noise spectra. Good agreement with Monte Carlo simulation of synthetic data and measurements of an Atomic Force Microscope (AFM) cantilever is demonstrated. These formulas enable robust interpretation of thermal noise spectra measurements commonly performed in the AFM and adaptive control of fitting procedures with specified tolerances.

  9. Fine precipitation scenarios of AlZnMg(Cu) alloys revealed by advanced atomic-resolution electron microscopy study Part I: Structure determination of the precipitates in AlZnMg(Cu) alloys

    SciTech Connect (OSTI)

    Liu, J.Z.; Chen, J.H.; Yuan, D.W.; Wu, C.L.; Zhu, J.; Cheng, Z.Y.

    2015-01-15

    Although they are among the most important precipitation-hardened materials for industry applications, the high-strength AlZnMg(Cu) alloys have thus far not yet been understood adequately about their underlying precipitation scenarios in relation with the properties. This is partly due to the fact that the structures of a number of different precipitates involved in electron microscopy in association with quantitative image simulations have to be employed; a systematic study of these hardening precipitates in different alloys is also necessary. In Part I of the present study, it is shown that there are five types of structurally different precipitates including the equilibrium η-phase precipitate. Using two state-of-the-art atomic-resolution imaging techniques in electron microscopy in association with quantitative image simulations, we have determined and clarified all the unknown precipitate structures. It is demonstrated that atomic-resolution imaging can directly suggest approximate structure models, whereas quantitative image analysis can refine the structure details that are much smaller than the resolution of the microscope. This combination is crucially important for solving the difficult structure problems of the strengthening precipitates in AlZnMg(Cu) alloys. - Highlights: Part I: • We determine and verify all the key precipitate structures in AlMgZn(Cu) alloys. • We employ aberration-corrected scanning transmission electron microscopy (STEM). • We use aberration-corrected high-resolution TEM (HRTEM) for the investigations. • We obtain atomic-resolution images of the precipitates and model their structures. • We refine all precipitate structures with quantitative image simulation analysis. Part II: • The hardening precipitates in AlZnMg alloys shall be classified into two groups. • Two precipitation scenarios coexist in the alloys. • The precipitation behavior of such an alloy depends on the alloy's composition. • Very detailed phase

  10. [Band electronic structures and crystal packing forces

    SciTech Connect (OSTI)

    Not Available

    1993-01-01

    We investigated the electronic and structural properties of low-dimensional materials and explored the structure-property correlations governing their physical properties. Progress was made on how to interpret the scanning tunneling microscopy and atomic force microscopy images of layered materials and on how to account for charge density wave instabilities in 2-D metals. Materials studied included transition metal chalcogenides, transition metal halides, organic conducting salts, Mo bronzes, A[sub 2]PdH[sub 2], fullerenes, squarate tetrahydrate polymers Fe, Cu(C[sub 4]O[sub 4])4[center dot]H[sub 2]O, BEDT salts, etc.

  11. Evaluation of the electrical contact area in contact-mode scanning probe microscopy

    SciTech Connect (OSTI)

    Celano, Umberto E-mail: u.celano@gmail.com; Chintala, Ravi Chandra; Vandervorst, Wilfried; Hantschel, Thomas; Giammaria, Guido; Conard, Thierry; Bender, Hugo

    2015-06-07

    The tunneling current through an atomic force microscopy (AFM) tip is used to evaluate the effective electrical contact area, which exists between tip and sample in contact-AFM electrical measurements. A simple procedure for the evaluation of the effective electrical contact area is described using conductive atomic force microscopy (C-AFM) in combination with a thin dielectric. We characterize the electrical contact area for coated metal and doped-diamond tips operated at low force (<200 nN) in contact mode. In both cases, we observe that only a small fraction (<10?nm{sup 2}) of the physical contact (?100?nm{sup 2}) is effectively contributing to the transport phenomena. Assuming this reduced area is confined to the central area of the physical contact, these results explain the sub-10?nm electrical resolution observed in C-AFM measurements.

  12. Interpretation of long-range interatomic force

    SciTech Connect (OSTI)

    Buldum, A.; Ciraci, S.; Fong, C.Y.; Nelson, J.S.

    1999-02-01

    Recent direct mechanical measurements of atomic force microscopy showed that the force between the silicon tip and the silicon sample is long range in the attractive region and its magnitude at maximum is relatively smaller. These features disagree with previous theoretical predictions based on the {ital ab initio} calculations. We investigated the nature of forces between a silicon tip and the silicon (111)-(2{times}1) surface by performing first-principles pseudopotential and classical molecular dynamics calculations and by calculating the van der Waals interaction. The first two methods give forces that are short range in nature. Fair agreement between the experiment and theory is obtained when the van der Waals interaction is included. The effect of the tip induced deformation is analyzed. {copyright} {ital 1999} {ital The American Physical Society}

  13. Low-temperature evolution of local polarization properties of PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} thin films probed by piezoresponse force microscopy

    SciTech Connect (OSTI)

    Andreeva, N. V.; Filimonov, A. V.; Rudskoy, A. I.; Tyunina, M.; Pertsev, N. A. Vakhrushev, S. B.

    2014-03-17

    The temperature evolution of local polarization properties in epitaxial PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} films is studied by the low-temperature piezoresponse force microscopy (PFM). Pronounced changes in the film polarization state, including apparent polarization rotations and possible transitions between single-domain and polydomain states of individual ferroelectric nanocolumns, are revealed on cooling from the room temperature to 8?K using PFM imaging. More than two-fold increase in the coercive voltage extracted from the piezoresponse hysteresis loops is found on cooling from 240 to 8?K. The results are explained by the thermodynamic theory of strained epitaxial perovskite ferroelectric films.

  14. NREL: Measurements and Characterization - Analytical Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Analytical Microscopy Analytical microscopy uses various high-resolution techniques to obtain information about materials on the atomic scale. It is one of the most powerful tools available for understanding a material's basic structure, chemistry, and morphology. We use two complementary types of analytical microscopy - electron microscopy and scanning probe microscopy - together with a variety of state-of-the-art imaging and analytical tools to capture data about photovoltaic (PV) materials

  15. Open Source Scanning Probe Microscopy Control Software package GXSM

    SciTech Connect (OSTI)

    Zahl, P.; Wagner, T.; Moller, R.; Klust, A.

    2010-05-01

    GXSM is a full featured and modern scanning probe microscopy (SPM) software. It can be used for powerful multidimensional image/data processing, analysis, and visualization. Connected to an instrument, it is operating many different flavors of SPM, e.g., scanning tunneling microscopy and atomic force microscopy or, in general, two-dimensional multichannel data acquisition instruments. The GXSM core can handle different data types, e.g., integer and floating point numbers. An easily extendable plug-in architecture provides many image analysis and manipulation functions. A digital signal processor subsystem runs the feedback loop, generates the scanning signals, and acquires the data during SPM measurements. The programmable GXSM vector probe engine performs virtually any thinkable spectroscopy and manipulation task, such as scanning tunneling spectroscopy or tip formation. The GXSM software is released under the GNU general public license and can be obtained via the internet.

  16. Modified Embedded Atom Method

    Energy Science and Technology Software Center (OSTI)

    2012-08-01

    Interatomic force and energy calculation subroutine to be used with the molecular dynamics simulation code LAMMPS (Ref a.). The code evaluated the total energy and atomic forces (energy gradient) according to a cubic spline-based variant (Ref b.) of the Modified Embedded Atom Method (MEAM) with a additional Stillinger-Weber (SW) contribution.

  17. Fine precipitation scenarios of AlZnMg(Cu) alloys revealed by advanced atomic-resolution electron microscopy study Part II: Fine precipitation scenarios in AlZnMg(Cu) alloys

    SciTech Connect (OSTI)

    Liu, J.Z.; Chen, J.H.; Liu, Z.R.; Wu, C.L.

    2015-01-15

    Although they are among the most important precipitation-hardened materials for industry applications, the high-strength AlZnMg(Cu) alloys have thus far not yet been understood adequately about their underlying precipitation scenarios in relation with the properties. This is partly due to the fact that the structures of a number of different precipitates involved in the alloys are unknown, and partly due to the complexity that the precipitation behaviors of the alloys may be closely related to the alloy's composition. In Part I of the present study, we have determined all the unknown precipitate structures in the alloys. Here in Part II, using atomic-resolution electron microscopy in association with the first principles energy calculations, we further studied and correlated the phase/structure transformation/evolution among these hardening precipitates in relation with the alloy's composition. It is shown that there are actually two coexisting classes of hardening precipitates in these alloys: the first class includes the η′-precipitates and their early-stage Guinier–Preston (GP-η′) zones; the second class includes the precursors of the equilibrium η-phase (referred to η{sub p}, or η-precursor) and their early-stage Guinier–Preston (GP-η{sub p}) zones. The two coexisting classes of precipitates correspond to two precipitation scenarios. - Highlights: • We determine and verify all the key precipitate structures in AlMgZn(Cu) alloys. • We employ aberration-corrected scanning transmission electron microscopy (STEM). • We use aberration-corrected high-resolution TEM (HRTEM) for the investigations. • We obtain atomic-resolution images of the precipitates and model their structures. • We refine all precipitate structures with quantitative image simulation analysis. • The hardening precipitates in AlZnMg alloys shall be classified into two groups. • Two precipitation scenarios coexist in the alloys. • The precipitation behavior of such an

  18. Domain Dynamics in Piezoresponse Force Microscopy: Quantitative...

    Office of Scientific and Technical Information (OSTI)

    The fine structure of the hysteresis loop is shown to be related to the observed jumps in the domain geometry during domain wall propagation (nanoscale Barkhausen jumps), ...

  19. Dynamic Transmission Electron Microscopy

    SciTech Connect (OSTI)

    Evans, James E.; Jungjohann, K. L.; Browning, Nigel D.

    2012-10-12

    Dynamic transmission electron microscopy (DTEM) combines the benefits of high spatial resolution electron microscopy with the high temporal resolution of ultrafast lasers. The incorporation of these two components into a single instrument provides a perfect platform for in situ observations of material processes. However, previous DTEM applications have focused on observing structural changes occurring in samples exposed to high vacuum. Therefore, in order to expand the pump-probe experimental regime to more natural environmental conditions, in situ gas and liquid chambers must be coupled with Dynamic TEM. This chapter describes the current and future applications of in situ liquid DTEM to permit time-resolved atomic scale observations in an aqueous environment, Although this chapter focuses mostly on in situ liquid imaging, the same research potential exists for in situ gas experiments and the successful integration of these techniques promises new insights for understanding nanoparticle, catalyst and biological protein dynamics with unprecedented spatiotemporal resolution.

  20. Electron Microscopy Center

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Argonne Home > EMC > EMC Home Electron Microscopy Center Web Site has moved This page has moved to http:www.anl.govcnmgroupelectron-microscopy-cente...

  1. Nanometer-scale electrochemical patterning of LiMn2O4 surfaces by an atomic force microscope operating in air

    SciTech Connect (OSTI)

    Kostecki, Robert; Bonhomme, Frederic; Servant, Laurent; Argoul, Francoise; McLarnon, Frank

    2001-06-22

    Electrochemical nanometer-scale patterning of the surface of a conducting lithium manganese oxide (LiMn{sub 2}O{sub 4}) by scanning probe microscopy (SPM) was studied. The ability to produce nanometer-size patterns of chemically modified oxide or nanometer-sized alterations of the oxide morphology is demonstrated and discussed with reference to possible mechanisms. It is demonstrated that unlike the SPM-based surface oxidation of metals and semiconductors, the LiMn{sub 2}O{sub 4} surface is altered via electrochemically generated species. We show that a localized surface chemical change can be confined to a depth which depends on the oxide-tip voltage difference and ambient humidity. In situ Raman microscopy measurements of localized electrochemical reaction products suggest complex mechanisms of processes induced at the LiMn{sub 2}O{sub 4} surface, such as delithiation through Li-proton exchange and disproportionation of LiMn{sub 2}O{sub 4} to MnO{sub 2} and soluble Mn{sup 2+} species.

  2. NREL: Measurements and Characterization - Scanning Probe Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scanning Probe Microscopy Photo of NREL researcher using scanning probe microscope. Capability of use with ultra-high vacuum makes NREL Scanning Probe Microscopy particularly valuable for certain applications. Scanning probe microscopy (SPM) provides surface images at up to atomic scale and other valuable high-resolution data. SPM encompasses a group of techniques that use very sharp tips that scan extremely closely (several nm) to or in contact with the material being analyzed. The interaction

  3. Center for Nanophase Materials Sciences (CNMS) - Imaging Functionality...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Ambient Scanning Probe Microscopy Magnetic Force Microscopy Electrical Force Microscopy Kelvin Probe Force Microscopy Conductive Atomic Force Microscopy Heated tip (blueDrive)...

  4. Electromechanical response of amorphous LaAlO{sub 3} thin film probed by scanning probe microscopies

    SciTech Connect (OSTI)

    Borowiak, Alexis S.; Baboux, Nicolas; Albertini, David; Gautier, Brice; Vilquin, Bertrand; Saint Girons, Guillaume; Pelloquin, Sylvain

    2014-07-07

    The electromechanical response of a 3 nm thick amorphous LaAlO{sub 3} layer obtained by molecular beam epitaxy has been studied using scanning probe microscopies. Although this kind of sample is not ferroelectric due to its amorphous nature, the resulting images are identical to what is generally obtained on truly ferroelectric samples probed by piezoresponse force microscopy: domains of apparently opposite polarisation are detected, and perfect, square shaped hysteresis loops are recorded. Moreover, written patterns are stable within 72 h. We discuss in the general case the possible origins of this behaviour in terms of charge injection, ionic conduction and motion of oxygen vacancies. In the case presented in this paper, since the writing process has been conducted with applied voltages lower than the injection threshold measured by conductive atomic force Microscopy, allowing to withdraw the hypothesis of charge injection in the sample, we propose that a bistable distribution of oxygen vacancies is responsible for this contrast.

  5. Three axis vector magnet set-up for cryogenic scanning probe microscopy

    SciTech Connect (OSTI)

    Galvis, J. A.; Herrera, E.; Buendía, A.; Guillamón, I.; Vieira, S.; Suderow, H.; Azpeitia, J.; Luccas, R. F.; Munuera, C.; García-Hernandez, M.; and others

    2015-01-15

    We describe a three axis vector magnet system for cryogenic scanning probe microscopy measurements. We discuss the magnet support system and the power supply, consisting of a compact three way 100 A current source. We obtain tilted magnetic fields in all directions with maximum value of 5T along z-axis and of 1.2T for XY-plane magnetic fields. We describe a scanning tunneling microscopy-spectroscopy (STM-STS) set-up, operating in a dilution refrigerator, which includes a new high voltage ultralow noise piezodrive electronics and discuss the noise level due to vibrations. STM images and STS maps show atomic resolution and the tilted vortex lattice at 150 mK in the superconductor β-Bi{sub 2}Pd. We observe a strongly elongated hexagonal lattice, which corresponds to the projection of the tilted hexagonal vortex lattice on the surface. We also discuss Magnetic Force Microscopy images in a variable temperature insert.

  6. [Band electronic structures and crystal packing forces]. Progress report, [March 1992--February 1993

    SciTech Connect (OSTI)

    Not Available

    1993-03-01

    We investigated the electronic and structural properties of low-dimensional materials and explored the structure-property correlations governing their physical properties. Progress was made on how to interpret the scanning tunneling microscopy and atomic force microscopy images of layered materials and on how to account for charge density wave instabilities in 2-D metals. Materials studied included transition metal chalcogenides, transition metal halides, organic conducting salts, Mo bronzes, A{sub 2}PdH{sub 2}, fullerenes, squarate tetrahydrate polymers Fe, Cu(C{sub 4}O{sub 4})4{center_dot}H{sub 2}O, BEDT salts, etc.

  7. Surface smoothing effect of an amorphous thin film deposited by atomic layer deposition on a surface with nano-sized roughness

    SciTech Connect (OSTI)

    Lau, W. S. Wan, X.; Xu, Y.; Wong, H.; Zhang, J.; Luo, J. K.; Institute of Renewable Energy and Environment Technology, Bolton University, Deane Road, Bolton BL3 5 AB

    2014-02-15

    Previously, Lau (one of the authors) pointed out that the deposition of an amorphous thin film by atomic layer deposition (ALD) on a substrate with nano-sized roughness probably has a surface smoothing effect. In this letter, polycrystalline zinc oxide deposited by ALD onto a smooth substrate was used as a substrate with nano-sized roughness. Atomic force microscopy (AFM) and cross-sectional transmission electron microscopy (XTEM) were used to demonstrate that an amorphous aluminum oxide thin film deposited by ALD can reduce the surface roughness of a polycrystalline zinc oxide coated substrate.

  8. Biomass Surface Characterization Laboratory (Fact Sheet), NREL...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microscopy and Raman microscopy * Transmission electron microscopy and tomography * Scanning electron microscopy and energy dispersive spectroscopy * Atomic force microscopy. ...

  9. The Collective Atomic Recoil Laser

    SciTech Connect (OSTI)

    Courteille, Ph.W.; Cube, C. avon; Deh, B.; Kruse, D.; Ludewig, A.; Slama, S.; Zimmermann, C.

    2005-05-05

    An ensemble of periodically ordered atoms coherently scatters the light of an incident laser beam. The scattered and the incident light may interfere and give rise to a light intensity modulation and thus to optical dipole forces which, in turn, emphasize the atomic ordering. This positive feedback is at the origin of the collective atomic recoil laser (CARL). We demonstrate this dynamics using ultracold atoms confined by dipole forces in a unidirectionally pumped far red-detuned high-finesse optical ring cavity. Under the influence of an additional dissipative force exerted by an optical molasses the atoms, starting from an unordered distribution, spontaneously form a density grating moving at constant velocity. Additionally, steady state lasing is observed in the reverse direction if the pump laser power exceeds a certain threshold. We compare the dynamics of the atomic trajectories to the behavior of globally coupled oscillators, which exhibit phase transitions from incoherent to coherent states if the coupling strength exceeds a critical value.

  10. Metal atomization spray nozzle

    DOE Patents [OSTI]

    Huxford, T.J.

    1993-11-16

    A spray nozzle for a magnetohydrodynamic atomization apparatus has a feed passage for molten metal and a pair of spray electrodes mounted in the feed passage. The electrodes, diverging surfaces which define a nozzle throat and diverge at an acute angle from the throat. Current passes through molten metal when fed through the throat which creates the Lorentz force necessary to provide atomization of the molten metal. 6 figures.

  11. Metal atomization spray nozzle

    DOE Patents [OSTI]

    Huxford, Theodore J.

    1993-01-01

    A spray nozzle for a magnetohydrodynamic atomization apparatus has a feed passage for molten metal and a pair of spray electrodes mounted in the feed passage. The electrodes, diverging surfaces which define a nozzle throat and diverge at an acute angle from the throat. Current passes through molten metal when fed through the throat which creates the Lorentz force necessary to provide atomization of the molten metal.

  12. Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments

    SciTech Connect (OSTI)

    Oiko, V. T. A. Rodrigues, V.; Ugarte, D.; Martins, B. V. C.; Silva, P. C.

    2014-03-15

    Understanding the mechanical properties of nanoscale systems requires new experimental and theoretical tools. In particular, force sensors compatible with nanomechanical testing experiments and with sensitivity in the nN range are required. Here, we report the development and testing of a tuning-fork-based force sensor for in situ nanomanipulation experiments inside a scanning electron microscope. The sensor uses a very simple design for the electronics and it allows the direct and quantitative force measurement in the 1100 nN force range. The sensor response is initially calibrated against a nN range force standard, as, for example, a calibrated Atomic Force Microscopy cantilever; subsequently, applied force values can be directly derived using only the electric signals generated by the tuning fork. Using a homemade nanomanipulator, the quantitative force sensor has been used to analyze the mechanical deformation of multi-walled carbon nanotube bundles, where we analyzed forces in the 540 nN range, measured with an error bar of a few nN.

  13. Domain formation and polarization reversal under atomic force microscopy-tip voltages in ion-sliced LiNbO{sub 3} films on SiO{sub 2}/LiNbO{sub 3} substrates

    SciTech Connect (OSTI)

    Gainutdinov, R. V.; Volk, T. R.; Zhang, H. H.

    2015-10-19

    We report on studies on writing of micro- and nanodomains and specified domain patterns by AFM-tip voltages U{sub DC} in thin (0.5 μm thick) ion-sliced LiNbO{sub 3} films embedded to SiO{sub 2}/LiNbO{sub 3} substrates. A peculiar feature is an overlapping of domains as the distance between them decreases. Piezoelectric hysteresis loops were measured in a wide range of U{sub DC} pulse durations. Domain dynamics and characteristics of hysteresis loops reveal marked distinctions from those observed so far in LiNbO{sub 3} films and bulk crystals.

  14. MEAM interatomic force calculation subroutine for LAMMPS

    Energy Science and Technology Software Center (OSTI)

    2010-10-25

    Interatomic force and energy calculation subroutine tobe used with the molecular dynamics simulation code LAMMPS (Ref a.). The code evaluates the total energy and atomic forces (energy gradient) according to cubic spine-based variant (Ref b.) of the Modified Embedded Atom Method (MEAM).

  15. protective force

    National Nuclear Security Administration (NNSA)

    ntex%20-%20protective%20force%20-%20edited.jpg" alt"successfully completed a recent assessment by the U.S. Department " >

    Members of Pantex's Protective Force on...

  16. Atomic layer deposition of zinc sulfide with Zn(TMHD){sub 2}

    SciTech Connect (OSTI)

    Short, Andrew; Jewell, Leila; Doshay, Sage; Church, Carena; Keiber, Trevor; Bridges, Frank; Carter, Sue; Alers, Glenn

    2013-01-15

    The atomic layer deposition (ALD) of ZnS films with Zn(TMHD){sub 2} and in situ generated H{sub 2}S as precursors was investigated, over a temperature range of 150-375 Degree-Sign C. ALD behavior was confirmed by investigation of growth behavior and saturation curves. The properties of the films were studied with atomic force microscopy, scanning electron microscopy, energy-dispersive x-ray spectroscopy, ultraviolet-visible-infrared spectroscopy, and extended x-ray absorption fine structure. The results demonstrate a film that can penetrate a porous matrix, with a local Zn structure of bulk ZnS, and a band gap between 3.5 and 3.6 eV. The ZnS film was used as a buffer layer in nanostructured PbS quantum dot solar cell devices.

  17. Dynamic force spectroscopy of parallel individual mucin1-antibody bonds

    SciTech Connect (OSTI)

    Sulchek, T A; Friddle, R W; Langry, K; Lau, E; Albrecht, H; Ratto, T; DeNardo, S; Colvin, M E; Noy, A

    2005-05-02

    We used atomic force microscopy (AFM) to measure the binding forces between Mucin1 (MUC1) peptide and a single chain antibody fragment (scFv) selected from a scFv library screened against MUC1. This binding interaction is central to the design of the molecules for targeted delivery of radioimmunotherapeutic agents for prostate and breast cancer treatment. Our experiments separated the specific binding interaction from non-specific interactions by tethering the antibody and MUC1 molecules to the AFM tip and sample surface with flexible polymer spacers. Rupture force magnitude and elastic characteristics of the spacers allowed identification of the bond rupture events corresponding to different number of interacting proteins. We used dynamic force spectroscopy to estimate the intermolecular potential widths and equivalent thermodynamic off rates for mono-, bi-, and tri-valent interactions. Measured interaction potential parameters agree with the results of molecular docking simulation. Our results demonstrate that an increase of the interaction valency leads to a precipitous decline in the dissociation rate. Binding forces measured for mono and multivalent interactions match the predictions of a Markovian model for the strength of multiple uncorrelated bonds in parallel configuration. Our approach is promising for comparison of the specific effects of molecular modifications as well as for determination of the best configuration of antibody-based multivalent targeting agents.

  18. Ribosome research in atomic detail offers potential insights...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A groundbreaking study of the human ribosome is revealing that the tiny molecular machine ... atomic-resolution model of the human ribosome consistent with microscopy. A). ...

  19. Electron Microscopy > Analytical Resources > Research > The Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Materials Center at Cornell Analytical Resources In This Section Differential Electrochemical Mass Spectroscopy (DEMS) Electron Microscopy X-Ray Diffraction Electron Microscopy Aberration-Corrected Electron Microscope Facility Electron microscopy provides atomic-resolution images of the structure, composition and bonding of our fuel cells and their components. Three-dimensional images of catalyst particles and their support materials are constructed using electron tomography - a similar

  20. air force

    National Nuclear Security Administration (NNSA)

    en NNSA, Air Force Complete Successful B61-12 Life Extension Program Development Flight Test at Tonopah Test Range http:nnsa.energy.govmediaroompressreleases...

  1. Atomic Resolution Imaging and Quantification of Chemical Functionality of Surfaces

    SciTech Connect (OSTI)

    Schwarz, Udo

    2014-12-10

    The work carried out from 2006-2014 under DoE support was targeted at developing new approaches to the atomic-scale characterization of surfaces that include species-selective imaging and an ability to quantify chemical surface interactions with site-specific accuracy. The newly established methods were subsequently applied to gain insight into the local chemical interactions that govern the catalytic properties of model catalysts of interest to DoE. The foundation of our work was the development of three-dimensional atomic force microscopy (3D-AFM), a new measurement mode that allows the mapping of the complete surface force and energy fields with picometer resolution in space (x, y, and z) and piconewton/millielectron volts in force/energy. From this experimental platform, we further expanded by adding the simultaneous recording of tunneling current (3D-AFM/STM) using chemically well-defined tips. Through comparison with simulations, we were able to achieve precise quantification and assignment of local chemical interactions to exact positions within the lattice. During the course of the project, the novel techniques were applied to surface-oxidized copper, titanium dioxide, and silicon oxide. On these materials, defect-induced changes to the chemical surface reactivity and electronic charge density were characterized with site-specific accuracy.

  2. ATOM | NISAC

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    NISACATOM content top Network Optimization Models (RNAS and ATOM) Posted by Admin on Mar 1, 2012 in | Comments 0 comments Many critical infrastructures can be represented by a...

  3. Atomic Scale Characterization of Compound Semiconductors Using Atom Probe Tomography

    SciTech Connect (OSTI)

    Gorman, B. P.; Norman, A. G.; Lawrence, D.; Prosa, T.; Guthrey, H.; Al-Jassim, M.

    2011-01-01

    Internal interfaces are critical in determining the performance of III-V multijunction solar cells. Studying these interfaces with atomic resolution using a combination of transmission electron microscopy (TEM), atom probe tomography (APT), and density functional calculations enables a more fundamental understanding of carrier dynamics in photovoltaic (PV) device structures. To achieve full atomic scale spatial and chemical resolution, data acquisition parameters in laser pulsed APT must be carefully studied to eliminate surface diffusion. Atom probe data with minimized group V ion clustering and expected stoichiometry can be achieved by adjusting laser pulse power, pulse repetition rate, and specimen preparation parameters such that heat flow away from the evaporating surface is maximized. Applying these improved analysis conditions to III-V based PV gives an atomic scale understanding of compositional and dopant profiles across interfaces and tunnel junctions and the initial stages of alloy clustering and dopant accumulation. Details on APT experimental methods and future in-situ instrumentation developments are illustrated.

  4. Force sensor

    DOE Patents [OSTI]

    Grahn, A.R.

    1993-05-11

    A force sensor and related method for determining force components is described. The force sensor includes a deformable medium having a contact surface against which a force can be applied, a signal generator for generating signals that travel through the deformable medium to the contact surface, a signal receptor for receiving the signal reflected from the contact surface, a generation controller, a reception controller, and a force determination apparatus. The signal generator has one or more signal generation regions for generating the signals. The generation controller selects and activates the signal generation regions. The signal receptor has one or more signal reception regions for receiving signals and for generating detections signals in response thereto. The reception controller selects signal reception regions and detects the detection signals. The force determination apparatus measures signal transit time by timing activation and detection and, optionally, determines force components for selected cross-field intersections. The timer which times by activation and detection can be any means for measuring signal transit time. A cross-field intersection is defined by the overlap of a signal generation region and a signal reception region.

  5. Force sensor

    DOE Patents [OSTI]

    Grahn, Allen R.

    1993-01-01

    A force sensor and related method for determining force components. The force sensor includes a deformable medium having a contact surface against which a force can be applied, a signal generator for generating signals that travel through the deformable medium to the contact surface, a signal receptor for receiving the signal reflected from the contact surface, a generation controller, a reception controller, and a force determination apparatus. The signal generator has one or more signal generation regions for generating the signals. The generation controller selects and activates the signal generation regions. The signal receptor has one or more signal reception regions for receiving signals and for generating detections signals in response thereto. The reception controller selects signal reception regions and detects the detection signals. The force determination apparatus measures signal transit time by timing activation and detection and, optionally, determines force components for selected cross-field intersections. The timer which times by activation and detection can be any means for measuring signal transit time. A cross-field intersection is defined by the overlap of a signal generation region and a signal reception region.

  6. Frontiers of in situ electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by inmore » this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.« less

  7. Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2005-08-26

    Establishes requirements for management and operation of the DOE Protective Force (PF), establishes requirements for firearms operations and defines the firearms courses of fire. Cancels: DOE M 473.2-1A DOE M 473.2-2

  8. Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2006-03-07

    The manual establishes requirements for management and operation of the DOE Protective Force, establishes requirements for firearms operations and defines the firearms courses of fire. Chg 1 dated 3/7/06. DOE M 470.4-3A cancels DOE M 470.4-3, Chg 1, Protective Force, dated 3-7-06, Attachment 2, Contractor Requirement Document (CRD) only (except for Section C). Chg 1, dated 3-7-06, cancels DOE M 470.4-3

  9. Photothermal imaging scanning microscopy

    DOE Patents [OSTI]

    Chinn, Diane; Stolz, Christopher J.; Wu, Zhouling; Huber, Robert; Weinzapfel, Carolyn

    2006-07-11

    Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.

  10. Study of Martensitic Phase transformation in a NiTiCu Thin Film Shape Memory Alloy Using Photoelectron Emission Microscopy

    SciTech Connect (OSTI)

    Cai, Mingdong; Langford, Stephen C.; Wu, Maggie J.; Huang, W. M.; Xiong, Gang; Droubay, Timothy C.; Joly, Alan G.; Beck, Kenneth; Hess, Wayne P.; Dickinson, J. T.

    2007-01-01

    The thermally-induced martensitic phase transformation in a polycrystalline NiTiCu thin film shape memory alloy was probed by photoelectron emission microscopy (PEEM). In situ PEEM images reveal distinct changes in microstructure and photoemission intensity at the phase transition temperatures. In particular, images of the low temperature, martensite phase are brighter than that of the high temperature, austenite phase, due to the relatively lower work function of the martensite. Ultra-violet photoelectron spectroscopy shows that the effective work function changes by about 0.16 eV during thermal cycling. In situ PEEM images also show that the network of trenches observed on the room temperature film disappear suddenly during heating and reappear suddenly during subsequent cooling. These trenches are also characterized by atomic force microscopy at selected temperatures. We describe implications of these observations with respect to the spatial distribution of phases during thermal cycling in this thin film shape memory alloy.

  11. Nonlinear vibrational microscopy

    DOE Patents [OSTI]

    Holtom, Gary R.; Xie, Xiaoliang Sunney; Zumbusch, Andreas

    2000-01-01

    The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. Microscopic imaging with a vibrational spectroscopic contrast is achieved by generating signals in a nonlinear optical process and spatially resolved detection of the signals. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a. directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b. collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c. removing the residual beam; and d. detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution then IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers. CARS and SFG microscopy does not rely on the presence of fluorophores, but retains the resolution and three-dimensional sectioning capability of confocal and two-photon fluorescence microscopy. Complementary to these techniques, CARS and SFG microscopy provides a contrast mechanism based on vibrational spectroscopy. This vibrational contrast mechanism, combined with an unprecedented high sensitivity at a tolerable laser power level, provides a new approach for microscopic investigations of chemical and biological samples.

  12. Atom Interferometry

    ScienceCinema (OSTI)

    Mark Kasevich

    2010-01-08

    Atom de Broglie wave interferometry has emerged as a tool capable of addressing a diverse set of questions in gravitational and condensed matter physics, and as an enabling technology for advanced sensors in geodesy and navigation. This talk will review basic principles, then discuss recent applications and future directions. Scientific applications to be discussed include measurement of G (Newton?s constant), tests of the Equivalence Principle and post-Newtonian gravity, and study of the Kosterlitz-Thouless phase transition in layered superfluids. Technology applications include development of precision gryoscopes and gravity gradiometers. The talk will conclude with speculative remarks looking to the future: Can atom interference methods be sued to detect gravity waves? Can non-classical (entangled/squeezed state) atom sources lead to meaningful sensor performance improvements?

  13. Atom Interferometry

    SciTech Connect (OSTI)

    Mark Kasevich

    2008-05-07

    Atom de Broglie wave interferometry has emerged as a tool capable of addressing a diverse set of questions in gravitational and condensed matter physics, and as an enabling technology for advanced sensors in geodesy and navigation. This talk will review basic principles, then discuss recent applications and future directions. Scientific applications to be discussed include measurement of G (Newton’s constant), tests of the Equivalence Principle and post-Newtonian gravity, and study of the Kosterlitz-Thouless phase transition in layered superfluids. Technology applications include development of precision gryoscopes and gravity gradiometers. The talk will conclude with speculative remarks looking to the future: Can atom interference methods be sued to detect gravity waves? Can non-classical (entangled/squeezed state) atom sources lead to meaningful sensor performance improvements?

  14. Lift Forces

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lift Forces in Bubbly Flows Thomas Daly ∗ , Sreekanth Pannala † , Arthur Ruggles ∗ ∗ Department of Nuclear Engineering, University of Tennessee, 315 Pasqua Engineering Building, Knoxville, TN, 37996-2300 † Oak Ridge National Laboratory, P.O. Box 2008, Bldg. 5700, MS 6164 Oak Ridge, TN 37831-6164 tdaly1@utk.edu, pannalas@ornl.gov, aruggles@utk.edu INTRODUCTION Multiphase flows are found in a variety of engineering systems, two of the most notable categories being energy pro- duction and

  15. Direct measurement of optical force induced by near-field plasmonic cavity using dynamic mode AFM

    SciTech Connect (OSTI)

    Guan, Dongshi; Hang, Zhi Hong; Marset, Zsolt; Liu, Hui; Kravchenko, Ivan I.; Chan, Ho Bun; Chan, C. T.; Tong, Penger

    2015-11-20

    Plasmonic nanostructures have attracted much attention in recent years because of their potential applications in optical manipulation through near-field enhancement. Continuing experimental efforts have been made to develop accurate techniques to directly measure the near-field optical force induced by the plasmonic nanostructures in the visible frequency range. In this work, we report a new application of dynamic mode atomic force microscopy (DM-AFM) in the measurement of the enhanced optical force acting on a nano-structured plasmonic resonant cavity. The plasmonic cavity is made of an upper gold-coated glass sphere and a lower quartz substrate patterned with an array of subwavelength gold disks. In the near-field when the sphere is positioned close to the disk array, plasmonic resonance is excited in the cavity and the induced force by a 1550 nm infrared laser is found to be increased by an order of magnitude compared with the photon pressure generated by the same laser light. Lastly, the experiment demonstrates that DM-AFM is a powerful tool for the study of light induced forces and their enhancement in plasmonic nanostructures.

  16. Direct measurement of optical force induced by near-field plasmonic cavity using dynamic mode AFM

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Guan, Dongshi; Hang, Zhi Hong; Marset, Zsolt; Liu, Hui; Kravchenko, Ivan I.; Chan, Ho Bun; Chan, C. T.; Tong, Penger

    2015-11-20

    Plasmonic nanostructures have attracted much attention in recent years because of their potential applications in optical manipulation through near-field enhancement. Continuing experimental efforts have been made to develop accurate techniques to directly measure the near-field optical force induced by the plasmonic nanostructures in the visible frequency range. In this work, we report a new application of dynamic mode atomic force microscopy (DM-AFM) in the measurement of the enhanced optical force acting on a nano-structured plasmonic resonant cavity. The plasmonic cavity is made of an upper gold-coated glass sphere and a lower quartz substrate patterned with an array of subwavelength goldmore » disks. In the near-field when the sphere is positioned close to the disk array, plasmonic resonance is excited in the cavity and the induced force by a 1550 nm infrared laser is found to be increased by an order of magnitude compared with the photon pressure generated by the same laser light. Lastly, the experiment demonstrates that DM-AFM is a powerful tool for the study of light induced forces and their enhancement in plasmonic nanostructures.« less

  17. Fourier plane imaging microscopy

    SciTech Connect (OSTI)

    Dominguez, Daniel Peralta, Luis Grave de; Alharbi, Nouf; Alhusain, Mdhaoui; Bernussi, Ayrton A.

    2014-09-14

    We show how the image of an unresolved photonic crystal can be reconstructed using a single Fourier plane (FP) image obtained with a second camera that was added to a traditional compound microscope. We discuss how Fourier plane imaging microscopy is an application of a remarkable property of the obtained FP images: they contain more information about the photonic crystals than the images recorded by the camera commonly placed at the real plane of the microscope. We argue that the experimental results support the hypothesis that surface waves, contributing to enhanced resolution abilities, were optically excited in the studied photonic crystals.

  18. Atomic magnetometer

    DOE Patents [OSTI]

    Schwindt, Peter; Johnson, Cort N.

    2012-07-03

    An atomic magnetometer is disclosed which uses a pump light beam at a D1 or D2 transition of an alkali metal vapor to magnetically polarize the vapor in a heated cell, and a probe light beam at a different D2 or D1 transition to sense the magnetic field via a polarization rotation of the probe light beam. The pump and probe light beams are both directed along substantially the same optical path through an optical waveplate and through the heated cell to an optical filter which blocks the pump light beam while transmitting the probe light beam to one or more photodetectors which generate electrical signals to sense the magnetic field. The optical waveplate functions as a quarter waveplate to circularly polarize the pump light beam, and as a half waveplate to maintain the probe light beam linearly polarized.

  19. Preliminary studies of the use of an automated flow-cell electrodeposition system for the formation of CdTe thin films by electrochemical atomic layer epitaxy

    SciTech Connect (OSTI)

    Huang, B.M.; Colletti, L.P.; Gregory, B.W.; Anderson, J.L.; Stickney, J.L.

    1995-09-01

    This paper is the first report of the formation of thin films, thicker than ten monolayers, using electrochemical atomic layer epitaxy (ECALE). Thin films of CdTe have been electrodeposited on polycrystalline gold substrates in an electrochemical thin-layer flow-cell deposition system using the ECALE methodology. Studies of the deposit morphology have been performed using scanning electron microscopy and atomic force microscope Significant improvements in deposit morphology are reported as a result of changes to the ECALE cycle program and deposition hardware. Deposit components analyzed using electron probe microanalysis and inductively coupled plasma atomic emission spectrometry, were found to be stoichiometric and nearly independent of the number of cycles and the Cd deposition potential. In addition, the deposition rate was shown to be one CdTe monolayer per cycle (half monolayer of Cd and half monolayer of Te per ECALE cycle).

  20. Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis

    SciTech Connect (OSTI)

    Wirtz, Tom; Fleming, Yves; Gerard, Mathieu; Gysin, Urs; Glatzel, Thilo; Meyer, Ernst; Wegmann, Urs; Maier, Urs; Odriozola, Aitziber Herrero; Uehli, Daniel

    2012-06-15

    State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical mappings with excellent sensitivity and spatial resolution. Several important artifacts however arise from the fact that SIMS 3D mapping does not take into account the surface topography of the sample. In order to correct these artifacts, we have integrated a specially developed scanning probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new high-precision sample stage, a scanner with a range of 100 {mu}m in x and y direction, and a dedicated SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy modes. Topographical information gained from AFM measurements taken before, during, and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D reconstruction using the software program 'SARINA,' which was developed for this first combined SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMS-SPM approach.

  1. Microscopy of photoionisation processes

    SciTech Connect (OSTI)

    Aseyev, S A; Mironov, B N; Minogin, V G; Cherkun, Aleksandr P; Chekalin, Sergei V

    2013-04-30

    A method is demonstrated which combines the ionisation of free molecules by a sharply focused femtosecond laser beam and projection microscopy in a divergent electric field. The electric field is produced in vacuum between a metallic tip and a flat positionsensitive charged particle detector. The method enables investigation of photoionisation processes in low-density gases with a subdiffraction spatial resolution and can be used as well in profile measurements for sharply focused, intense laser beams. In a demonstration experiment, a femtosecond laser beam with a peak intensity of {approx}10{sup 14} W cm{sup -2} was focused to a 40-{mu}m-diameter waist in vacuum near a millimetre-size tip and {approx}2-{mu}m spatial resolution was achieved. According to our estimates, the use of a sharper tip will ensure a submicron spatial resolution, which is a crucial condition for the spatial diagnostics of sharply focused short-wavelength VUV radiation and X-rays. (extreme light fields and their applications)

  2. Ultrafast scanning probe microscopy

    DOE Patents [OSTI]

    Weiss, S.; Chemla, D.S.; Ogletree, D.F.; Botkin, D.

    1995-05-16

    An ultrafast scanning probe microscopy method is described for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample. 6 Figs.

  3. Ultrafast scanning probe microscopy

    DOE Patents [OSTI]

    Weiss, Shimon; Chemla, Daniel S.; Ogletree, D. Frank; Botkin, David

    1995-01-01

    An ultrafast scanning probe microscopy method for achieving subpicosecond-temporal resolution and submicron-spatial resolution of an observation sample. In one embodiment of the present claimed invention, a single short optical pulse is generated and is split into first and second pulses. One of the pulses is delayed using variable time delay means. The first pulse is then directed at an observation sample located proximate to the probe of a scanning probe microscope. The scanning probe microscope produces probe-sample signals indicative of the response of the probe to characteristics of the sample. The second pulse is used to modulate the probe of the scanning probe microscope. The time delay between the first and second pulses is then varied. The probe-sample response signal is recorded at each of the various time delays created between the first and second pulses. The probe-sample response signal is then plotted as a function of time delay to produce a cross-correlation of the probe sample response. In so doing, the present invention provides simultaneous subpicosecond-temporal resolution and submicron-spatial resolution of the sample.

  4. The Future of Electron Microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei

    2015-05-06

    Berkeley Lab scientist Haimei Zheng discusses the future of electron microscopy and her breakthrough research into examining liquids using an electron microscope.

  5. Effect of silica nanoparticles on morphology of segmented polyurethane...

    Office of Scientific and Technical Information (OSTI)

    Atomic force microscopy revealed a strong effect of nanoparticles on the large-scale ... Subject: 36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; FILLERS; GLASS; MELTING; MELTING ...

  6. Single-layer MoS{sub 2} roughness and sliding friction quenching by interaction with atomically flat substrates

    SciTech Connect (OSTI)

    Quereda, J.; Castellanos-Gomez, A.; Agrat, N.; Rubio-Bollinger, G.

    2014-08-04

    We experimentally study the surface roughness and the lateral friction force in single-layer MoS{sub 2} crystals deposited on different substrates: SiO{sub 2}, mica, and hexagonal boron nitride (h-BN). Roughness and sliding friction measurements are performed by atomic force microscopy. We find a strong dependence of the MoS{sub 2} roughness on the underlying substrate material, being h-BN the substrate which better preserves the flatness of the MoS{sub 2} crystal. The lateral friction also lowers as the roughness decreases, and attains its lowest value for MoS{sub 2} flakes on h-BN substrates. However, it is still higher than for the surface of a bulk MoS{sub 2} crystal, which we attribute to the deformation of the flake due to competing tip-to-flake and flake-to-substrate interactions.

  7. Nucleation and growth of ZnO on PMMA by low-temperature atomic layer deposition

    SciTech Connect (OSTI)

    Napari, Mari Malm, Jari; Lehto, Roope; Julin, Jaakko; Arstila, Kai; Sajavaara, Timo; Lahtinen, Manu

    2015-01-15

    ZnO films were grown by atomic layer deposition at 35?C on poly(methyl methacrylate) substrates using diethylzinc and water precursors. The film growth, morphology, and crystallinity were studied using Rutherford backscattering spectrometry, time-of-flight elastic recoil detection analysis, atomic force microscopy, scanning electron microscopy, and x-ray diffraction. The uniform film growth was reached after several hundreds of deposition cycles, preceded by the precursor penetration into the porous bulk and island-type growth. After the full surface coverage, the ZnO films were stoichiometric, and consisted of large grains (diameter 30?nm) with a film surface roughness up to 6?nm (RMS). The introduction of Al{sub 2}O{sub 3} seed layer enhanced the initial ZnO growth substantially and changed the surface morphology as well as the crystallinity of the deposited ZnO films. Furthermore, the water contact angles of the ZnO films were measured, and upon ultraviolet illumination, the ZnO films on all the substrates became hydrophilic, independent of the film crystallinity.

  8. Atomic Chemistry in Turbulent Media I: Effect of Atomic Cooling...

    Office of Scientific and Technical Information (OSTI)

    Atomic Chemistry in Turbulent Media I: Effect of Atomic Cooling Citation Details In-Document Search Title: Atomic Chemistry in Turbulent Media I: Effect of Atomic Cooling Authors: ...

  9. Atom Trajectory Viewer

    Energy Science and Technology Software Center (OSTI)

    2015-12-28

    Atom Trajectory Viewer is a visualization tool developed to enable interactive exploration of atomic trajectories and corresponding statistics in molecular dynamics.

  10. Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision

    SciTech Connect (OSTI)

    Jesse, Stephen; He, Qian; Lupini, Andrew R.; Leonard, Donovan N.; Oxley, Mark P.; Ovchinnikov, Oleg; Unocic, Raymond R.; Tselev, Alexander; Fuentes-Cabrera, Miguel; Sumpter, Bobby G.; Pennycook, Stephen J.; Kalinin, Sergei V.; Borisevich, Albina Y.

    2015-10-19

    We demonstrate atomic-level sculpting of 3D crystalline oxide nanostructures from metastable amorphous layer in a scanning transmission electron microscope (STEM). Strontium titanate nanostructures grow epitaxially from the crystalline substrate following the beam path. This method can be used for fabricating crystalline structures as small as 1-2 nm and the process can be observed in situ with atomic resolution. We further demonstrate fabrication of arbitrary shape structures via control of the position and scan speed of the electron beam. Combined with broad availability of the atomic resolved electron microscopy platforms, these observations suggest the feasibility of large scale implementation of bulk atomic-level fabrication as a new enabling tool of nanoscience and technology, providing a bottom-up, atomic-level complement to 3D printing.

  11. Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Jesse, Stephen; He, Qian; Lupini, Andrew R.; Leonard, Donovan N.; Oxley, Mark P.; Ovchinnikov, Oleg; Unocic, Raymond R.; Tselev, Alexander; Fuentes-Cabrera, Miguel; Sumpter, Bobby G.; et al

    2015-10-19

    We demonstrate atomic-level sculpting of 3D crystalline oxide nanostructures from metastable amorphous layer in a scanning transmission electron microscope (STEM). Strontium titanate nanostructures grow epitaxially from the crystalline substrate following the beam path. This method can be used for fabricating crystalline structures as small as 1-2 nm and the process can be observed in situ with atomic resolution. We further demonstrate fabrication of arbitrary shape structures via control of the position and scan speed of the electron beam. Combined with broad availability of the atomic resolved electron microscopy platforms, these observations suggest the feasibility of large scale implementation of bulkmore » atomic-level fabrication as a new enabling tool of nanoscience and technology, providing a bottom-up, atomic-level complement to 3D printing.« less

  12. Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

    SciTech Connect (OSTI)

    Eliseev, E. A.; Morozovska, A. N.; Ievlev, Anton; Balke, Nina; Maksymovych, Petro; Tselev, Alexander; Kalinin, Sergei V

    2014-01-01

    Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

  13. If Only We Could Account For Every Atom (LBNL Summer Lecture Series)

    ScienceCinema (OSTI)

    Kisielowski, Christian

    2014-05-06

    Christian Kisielowski, an expert in electron microscopy at Lawrence Berkeley National Laboratory, investigates ways to allow studies of single atoms using sophisticated microscopes and imaginative techniques. His goal is to account for every atom in the interior of both simple and complex materials. Find out how he and his colleagues are breaking the barriers to account for every atom.

  14. A national facility for biological cryo-electron microscopy

    SciTech Connect (OSTI)

    Saibil, Helen R.; Grnewald, Kay; Stuart, David I.

    2015-01-01

    This review provides a brief update on the use of cryo-electron microscopy for integrated structural biology, along with an overview of the plans for the UK national facility for electron microscopy being built at the Diamond synchrotron. Three-dimensional electron microscopy is an enormously powerful tool for structural biologists. It is now able to provide an understanding of the molecular machinery of cells, disease processes and the actions of pathogenic organisms from atomic detail through to the cellular context. However, cutting-edge research in this field requires very substantial resources for equipment, infrastructure and expertise. Here, a brief overview is provided of the plans for a UK national three-dimensional electron-microscopy facility for integrated structural biology to enable internationally leading research on the machinery of life. State-of-the-art equipment operated with expert support will be provided, optimized for both atomic-level single-particle analysis of purified macromolecules and complexes and for tomography of cell sections. The access to and organization of the facility will be modelled on the highly successful macromolecular crystallography (MX) synchrotron beamlines, and will be embedded at the Diamond Light Source, facilitating the development of user-friendly workflows providing near-real-time experimental feedback.

  15. Structural, electrical, and optical properties of atomic layer deposition Al-doped ZnO films

    SciTech Connect (OSTI)

    Banerjee, P; Lee, W. J.; Bae, K. R.; Lee, Sang Bok; Rubloff, Gary W

    2010-01-01

    Al-doped ZnO (AZO) films of ∼100 nm thickness with various Aldoping were prepared at 150 °C by atomic layer deposition on quartz substrates. At low Aldoping, the films were strongly textured along the [100] direction, while at higher Aldoping the films remained amorphous. Atomic force microscopy results showed that Al–O cycles when inserted in a ZnOfilm, corresponding to a few atomic percent Al, could remarkably reduce the surface roughness of the films. Hall measurements revealed a maximum mobility of 17.7 cm{sup 2} /V s . Film resistivity reached a minima of 4.4×10{sup −3}  Ω cm whereas the carrier concentration reached a maxima of 1.7×10{sup 20}  cm{sup −3} , at 3 at. % Al. The band gap of AZO films varied from 3.23 eV for undoped ZnOfilms to 3.73 eV for AZO films with 24.6 at. % Al. Optical transmittance over 80% was obtained in the visible region. The detrimental impact of increased Al resulting in decreased conductivity due to doping past 3.0 at. % is evident in the x-ray diffraction data, as an abrupt increase in the optical band gap and as a deviation from the Burstein–Moss effect.

  16. An improved proximity force approximation for electrostatics

    SciTech Connect (OSTI)

    Fosco, Cesar D.; Instituto Balseiro, Universidad Nacional de Cuyo, R8402AGP Bariloche ; Lombardo, Fernando C.; IFIBA ; Mazzitelli, Francisco D.

    2012-08-15

    A quite straightforward approximation for the electrostatic interaction between two perfectly conducting surfaces suggests itself when the distance between them is much smaller than the characteristic lengths associated with their shapes. Indeed, in the so called 'proximity force approximation' the electrostatic force is evaluated by first dividing each surface into a set of small flat patches, and then adding up the forces due two opposite pairs, the contributions of which are approximated as due to pairs of parallel planes. This approximation has been widely and successfully applied in different contexts, ranging from nuclear physics to Casimir effect calculations. We present here an improvement on this approximation, based on a derivative expansion for the electrostatic energy contained between the surfaces. The results obtained could be useful for discussing the geometric dependence of the electrostatic force, and also as a convenient benchmark for numerical analyses of the tip-sample electrostatic interaction in atomic force microscopes. - Highlights: Black-Right-Pointing-Pointer The proximity force approximation (PFA) has been widely used in different areas. Black-Right-Pointing-Pointer The PFA can be improved using a derivative expansion in the shape of the surfaces. Black-Right-Pointing-Pointer We use the improved PFA to compute electrostatic forces between conductors. Black-Right-Pointing-Pointer The results can be used as an analytic benchmark for numerical calculations in AFM. Black-Right-Pointing-Pointer Insight is provided for people who use the PFA to compute nuclear and Casimir forces.

  17. Visualizing Individual Carbon Nanotubes with Optical Microscopy...

    Office of Scientific and Technical Information (OSTI)

    Published Article: Visualizing Individual Carbon Nanotubes with Optical Microscopy Title: Visualizing Individual Carbon Nanotubes with Optical Microscopy Authors: Novak, Michael A. ...

  18. Electron Microscopy Catalysis Projects: Success Stories from...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Electron Microscopy Catalysis Projects: Success Stories from the High Temperature Materials Laboratory (HTML) User Program Electron Microscopy Catalysis Projects: Success Stories ...

  19. Reflected beam illumination microscopy using a microfluidics...

    Office of Scientific and Technical Information (OSTI)

    Reflected beam illumination microscopy using a microfluidics device - progress report 6152014. Citation Details In-Document Search Title: Reflected beam illumination microscopy ...

  20. The future of electron microscopy

    SciTech Connect (OSTI)

    Zhu, Yimei; Durr, Hermann

    2015-04-01

    Seeing is believing. So goes the old adage and seen evidence is undoubtedly satisfying because it can be interpreted easily, though not always correctly. For centuries, humans have developed such instruments as telescopes that observe the heavens and microscopes that reveal bacteria and viruses. The 2014 Nobel Prize in Chemistry was awarded to Eric Betzig, Stefan Hell, and William Moerner for their foundational work on superresolution fluorescence microscopy in which they overcame the Abbe diffraction limit for the resolving power of conventional light microscopes. (See Physics Today, December 2014, page 18.) That breakthrough enabled discoveries in biological research and testifies to the importance of modern microscopy.

  1. The future of electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhu, Yimei; Durr, Hermann

    2015-04-01

    Seeing is believing. So goes the old adage and seen evidence is undoubtedly satisfying because it can be interpreted easily, though not always correctly. For centuries, humans have developed such instruments as telescopes that observe the heavens and microscopes that reveal bacteria and viruses. The 2014 Nobel Prize in Chemistry was awarded to Eric Betzig, Stefan Hell, and William Moerner for their foundational work on superresolution fluorescence microscopy in which they overcame the Abbe diffraction limit for the resolving power of conventional light microscopes. (See Physics Today, December 2014, page 18.) That breakthrough enabled discoveries in biological research and testifiesmore » to the importance of modern microscopy.« less

  2. Protective Force Program Manual

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2000-06-30

    Provides detailed requirements to supplement DOE O 473.2, Protective Force Program, which establishes the requirements and responsibilities for management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Does not cancel other directives.

  3. Administering Work Force Discipline

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2015-05-14

    The order provides requirements and responsibilities for administering work force discipline and corrective actions. Supersedes DOE O 3750.1.

  4. Fluid force transducer

    DOE Patents [OSTI]

    Jendrzejczyk, Joseph A.

    1982-01-01

    An electrical fluid force transducer for measuring the magnitude and direction of fluid forces caused by lateral fluid flow, includes a movable sleeve which is deflectable in response to the movement of fluid, and a rod fixed to the sleeve to translate forces applied to the sleeve to strain gauges attached to the rod, the strain gauges being connected in a bridge circuit arrangement enabling generation of a signal output indicative of the magnitude and direction of the force applied to the sleeve.

  5. Atomizing nozzle and process

    DOE Patents [OSTI]

    Anderson, Iver E.; Figliola, Richard S.; Molnar, Holly M.

    1993-07-20

    High pressure atomizing nozzle includes a high pressure gas manifold having a divergent expansion chamber between a gas inlet and arcuate manifold segment to minimize standing shock wave patterns in the manifold and thereby improve filling of the manifold with high pressure gas for improved melt atomization. The atomizing nozzle is especially useful in atomizing rare earth-transition metal alloys to form fine powder particles wherein a majority of the powder particles exhibit particle sizes having near-optimum magnetic properties.

  6. Atomizing nozzle and process

    DOE Patents [OSTI]

    Anderson, Iver E.; Figliola, Richard S.; Molnar, Holly M.

    1992-06-30

    High pressure atomizing nozzle includes a high pressure gas manifold having a divergent expansion chamber between a gas inlet and arcuate manifold segment to minimize standing shock wave patterns in the manifold and thereby improve filling of the manifold with high pressure gas for improved melt atomization. The atomizing nozzle is especially useful in atomizing rare earth-transition metal alloys to form fine powder particles wherein a majority of the powder particles exhibit particle sizes having near-optimum magnetic properties.

  7. Atomic Energy Commission Takes Over Responsibility for all Atomic...

    National Nuclear Security Administration (NNSA)

    Takes Over Responsibility for all Atomic Energy Programs Atomic Energy Commission Takes Over Responsibility for all Atomic Energy Program Washington, DC In accordance with the ...

  8. LaAlO{sub 3} thickness window for electronically controlled magnetism...

    Office of Scientific and Technical Information (OSTI)

    Country of input: International Atomic Energy Agency (IAEA) Country of Publication: ... ATOMIC FORCE MICROSCOPY; CAPACITANCE; CARRIER DENSITY; FERROMAGNETISM; LANTHANUM ...

  9. Atomic Energy Commission : Atomic Power at Shippingport - 1958 Educational Film

    SciTech Connect (OSTI)

    2013-02-02

    The United States Atomic Energy Commission & Westinghouse Electric Company take us on a tour of an atomic power station.

  10. PARTICLE ACCELERATORS; 74 ATOMIC AND MOLECULAR PHYSICS; ATOMS...

    Office of Scientific and Technical Information (OSTI)

    74 ATOMIC AND MOLECULAR PHYSICS; ATOMS; ELECTRONS; HELIUM; LIGHT SOURCES; RADIATIONS; STORAGE RINGS; SYNCHROTRONS SYNCHROTRON RADIATION SYNCHROTRONLIGHT SOURCES QUANTUM CHAOS...

  11. Atomic Energy Commission : Atomic Power at Shippingport - 1958 Educational Film

    ScienceCinema (OSTI)

    None

    2014-07-31

    The United States Atomic Energy Commission & Westinghouse Electric Company take us on a tour of an atomic power station.

  12. Coulomb force as an entropic force

    SciTech Connect (OSTI)

    Wang Tower

    2010-05-15

    Motivated by Verlinde's theory of entropic gravity, we give a tentative explanation to the Coulomb's law with an entropic force. When trying to do this, we find the equipartition rule should be extended to charges and the concept of temperature should be reinterpreted. If one accepts the holographic principle as well as our generalizations and reinterpretations, then Coulomb's law, the Poisson equation, and the Maxwell equations can be derived smoothly. Our attempt can be regarded as a new way to unify the electromagnetic force with gravity, from the entropic origin. Possibly some of our postulates are related to the D-brane picture of black hole thermodynamics.

  13. Dynamic imaging with electron microscopy

    ScienceCinema (OSTI)

    Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

    2014-05-30

    Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

  14. Atomic Energy Commission Takes Over Responsibility for all Atomic Energy

    National Nuclear Security Administration (NNSA)

    Programs | National Nuclear Security Administration | (NNSA) Takes Over Responsibility for all Atomic Energy Programs Atomic Energy Commission Takes Over Responsibility for all Atomic Energy Program Washington, DC In accordance with the Atomic Energy Act of 1946, all atomic energy activities are transferred to the newly created Atomic Energy Commission

  15. Mechanism of force mode dip-pen nanolithography

    SciTech Connect (OSTI)

    Yang, Haijun E-mail: swguo@sjtu.edu.cn; Xie, Hui; Rong, Weibin; Sun, Lining; Wu, Haixia; Guo, Shouwu E-mail: swguo@sjtu.edu.cn

    2014-05-07

    In this work, the underlying mechanism of the force mode dip-pen nanolithography (FMDPN) is investigated in depth by analyzing force curves, tapping mode deflection signals, and Z-scan voltage variations during the FMDPN. The operation parameters including the relative trigger threshold and surface delay parameters are vital to control the loading force and dwell time for ink deposition during FMDPN. A model is also developed to simulate the interactions between the atomic force microscope tip and soft substrate during FMDPN, and verified by its good performance in fitting our experimental data.

  16. Hill Air Force Base

    Broader source: Energy.gov [DOE]

    Energy savings performance contracting at Hill Air Force Base generated much interest during a recent training session on energy management that downlinked 12 Department of Defense sites. Energy...

  17. Metal atom oxidation laser

    DOE Patents [OSTI]

    Jensen, R.J.; Rice, W.W.; Beattie, W.H.

    1975-10-28

    A chemical laser which operates by formation of metal or carbon atoms and reaction of such atoms with a gaseous oxidizer in an optical resonant cavity is described. The lasing species are diatomic or polyatomic in nature and are readily produced by exchange or other abstraction reactions between the metal or carbon atoms and the oxidizer. The lasing molecules may be metal or carbon monohalides or monoxides. (auth)

  18. Metal atom oxidation laser

    DOE Patents [OSTI]

    Jensen, R.J.; Rice, W.W.; Beattie, W.H.

    1975-10-28

    A chemical laser which operates by formation of metal or carbon atoms and reaction of such atoms with a gaseous oxidizer in an optical resonant cavity is described. The lasing species are diatomic or polyatomic in nature and are readily produced by exchange or other abstraction reactions between the metal or carbon atoms and the oxidizer. The lasing molecules may be metal or carbon monohalides or monoxides.

  19. Ultrafast Optical Microscopy of Single Monolayer Molybdenum Disulfide Flakes

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Seo, Minah; Yamaguchi, Hisato; Mohite, Aditya D.; Boubanga-Tombet, Stephane; Blancon, Jean-Christophe; Najmaei, Sina; Ajayan, Pulickel M.; Lou, Jun; Taylor, Antoinette J.; Prasankumar, Rohit P.

    2016-02-15

    We performed ultrafast optical microscopy on single flakes of atomically thin CVD-grown molybdenum disulfide, using non-degenerate femtosecond pump-probe spectroscopy to excite and probe carriers above and below the indirect and direct band gaps. These measurements reveal the influence of layer thickness on carrier dynamics when probing near the band gap. Furthermore, fluence-dependent measurements indicate that carrier relaxation is primarily influenced by surface-related defect and trap states after above-bandgap photoexcitation. Furthermore, the ability to probe femtosecond carrier dynamics in individual flakes can thus give much insight into light-matter interactions in these two-dimensional nanosystems.

  20. Improved graphite furnace atomizer

    DOE Patents [OSTI]

    Siemer, D.D.

    1983-05-18

    A graphite furnace atomizer for use in graphite furnace atomic absorption spectroscopy is described wherein the heating elements are affixed near the optical path and away from the point of sample deposition, so that when the sample is volatilized the spectroscopic temperature at the optical path is at least that of the volatilization temperature, whereby analyteconcomitant complex formation is advantageously reduced. The atomizer may be elongated along its axis to increase the distance between the optical path and the sample deposition point. Also, the atomizer may be elongated along the axis of the optical path, whereby its analytical sensitivity is greatly increased.

  1. The Harnessed Atom

    Broader source: Energy.gov [DOE]

    The Harnessed Atom is a new middle school science, technology, engineering, and math (STEM) curriculum extension that focuses on nuclear science and energy. It offers teachers accurate, unbiased,...

  2. Atomic Structure of Au329(SR)84 Faradaurate Plasmonic Nanomolecules

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Kumara, Chanaka; Zuo, Xiaobing; Ilavsky, Jan; Cullen, David; Dass, Amala

    2015-04-03

    To design novel nanomaterials, it is important to precisely control the composition, determine the atomic structure, and manipulate the structure to tune the materials property. Here we present a comprehensive characterization of the material whose composition is Au329(SR)84 precisely, therefore referred to as a nanomolecule. The size homogeneity was shown by electron microscopy, solution X-ray scattering, and mass spectrometry. We proposed its atomic structure to contain the Au260 core using experiments and modeling of a total-scattering-based atomic-pair distribution functional analysis. HAADF-STEM images shows fcc-like 2.0 ± 0.1 nm diameter nanomolecules.

  3. Protective Force Program Manual

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2001-12-20

    Provides detailed requirements to supplement DOE O 473.2, PROTECTIVE FORCE PROGRAM, which establishes the requirements and responsibilities for management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Change 1 revised pages in Chapters IV and VI on 12/20/2001.

  4. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E.; Parvin, Bahram

    2009-06-09

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time: quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  5. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E.; Parvin, Bahram

    2011-05-24

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  6. Visual-servoing optical microscopy

    DOE Patents [OSTI]

    Callahan, Daniel E; Parvin, Bahram

    2013-10-01

    The present invention provides methods and devices for the knowledge-based discovery and optimization of differences between cell types. In particular, the present invention provides visual servoing optical microscopy, as well as analysis methods. The present invention provides means for the close monitoring of hundreds of individual, living cells over time; quantification of dynamic physiological responses in multiple channels; real-time digital image segmentation and analysis; intelligent, repetitive computer-applied cell stress and cell stimulation; and the ability to return to the same field of cells for long-term studies and observation. The present invention further provides means to optimize culture conditions for specific subpopulations of cells.

  7. Combining Quantitative Electrochemistry and Electron Microscopy...

    Office of Scientific and Technical Information (OSTI)

    Conference: Combining Quantitative Electrochemistry and Electron Microscopy to Study ... Resource Relation: Conference: Proposed for presentation at the Materials Research Society ...

  8. High-Resolution Transmission Electron Microscopy Observation of Colloidal Nanocrystal Growth Mechanisms using Graphene Liquid Cells

    SciTech Connect (OSTI)

    Yuk, Jong Min; Park, Jungwon; Ercius, Peter; Kim, Kwanpyo; Hellebusch, Danny J.; Crommie, Michael F.; Lee, Jeong Yong; Zettl, A.; Alivisatos, A. Paul

    2011-12-12

    We introduce a new type of liquid cell for in-situ electron microscopy based upon entrapment of a liquid film between layers of graphene. We employ this cell to achieve high-resolution imaging of colloidal platinum nanocrystal growth. The ability to directly image and resolve critical steps at atomic resolution provides new insights into nanocrystal coalescence and reshaping during growth.

  9. Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ishikawa, Ryo; Lupini, Andrew R.; Hinuma, Yoyo; Pennycook, Stephen

    2014-11-26

    To completely understand and control materials and their properties, it is of critical importance to determine their atomic structures in all three dimensions. Recent revolutionary advances in electron optics – the inventions of geometric and chromatic aberration correctors as well as electron source monochromators – have provided fertile ground for performing optical depth sectioning at atomic-scale dimensions. In this study we theoretically demonstrate the imaging of top/sub-surface atomic structures and identify the depth of single dopants, single vacancies and the other point defects within materials by large-angle illumination scanning transmission electron microscopy (LAI-STEM). The proposed method also allows us tomore » measure specimen properties such as thickness or three-dimensional surface morphology using observations from a single crystallographic orientation.« less

  10. OOTW Force Design Tools

    SciTech Connect (OSTI)

    Bell, R.E.; Hartley, D.S.III; Packard, S.L.

    1999-05-01

    This report documents refined requirements for tools to aid the process of force design in Operations Other Than War (OOTWs). It recommends actions for the creation of one tool and work on other tools relating to mission planning. It also identifies the governmental agencies and commands with interests in each tool, from whom should come the user advisory groups overseeing the respective tool development activities. The understanding of OOTWs and their analytical support requirements has matured to the point where action can be taken in three areas: force design, collaborative analysis, and impact analysis. While the nature of the action and the length of time before complete results can be expected depends on the area, in each case the action should begin immediately. Force design for OOTWs is not a technically difficult process. Like force design for combat operations, it is a process of matching the capabilities of forces against the specified and implied tasks of the operation, considering the constraints of logistics, transport and force availabilities. However, there is a critical difference that restricts the usefulness of combat force design tools for OOTWs: the combat tools are built to infer non-combat capability requirements from combat capability requirements and cannot reverse the direction of the inference, as is required for OOTWs. Recently, OOTWs have played a larger role in force assessment, system effectiveness and tradeoff analysis, and concept and doctrine development and analysis. In the first Quadrennial Defense Review (QDR), each of the Services created its own OOTW force design tool. Unfortunately, the tools address different parts of the problem and do not coordinate the use of competing capabilities. These tools satisfied the immediate requirements of the QDR, but do not provide a long-term cost-effective solution.

  11. Frontiers of in situ electron microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by in this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.

  12. Reduction-in-Force

    Broader source: Energy.gov [DOE]

    Reduction in force (RIF) is a set of regulations and procedures that are used to determine whether an employee keeps his or her present position, or whether the employee has a right to another...

  13. Protective Force Program

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1995-02-13

    To prescribe Department of Energy policy, responsibilities, and requirements for the management and operation of the Protective Force Program. Chg 1 dated 2-13-95. Cancels DOE O 5632.7 and DOE O 5632.8.

  14. Three-body forces

    SciTech Connect (OSTI)

    Nefkens, B.M.K.

    1986-10-15

    A review of current knowledge of three-body forces from experimental and theoretical standpoints is given. The 3-H and 3-He nuclei are discussed. Also, nucleon scattering from deuterium is discussed. (AIP)

  15. Federal Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2009-07-15

    This Manual establishes requirements for the management and operation of the Department of Energy (DOE) Federal protective forces (FPFs). Cancels DOE M 470.4-3, Chg 1. Canceled by DOE O 473.3.

  16. Local structures of high-entropy alloys (HEAs) on atomic scales: An overview

    SciTech Connect (OSTI)

    Diao, Haoyan; Santodonato, Louis J.; Tang, Zhi; Egami, Takeshi; Liaw, Peter K.

    2015-08-29

    The high-entropy alloys, containing several elements mixed in equimolar or near-equimolar ratios, have shown exceptional engineering properties. Local structures on the atomic level are essential to understand the mechanical behaviors and related mechanisms. This article covers the local structure and stress on the atomic level are reviewed by the pair-distribution function of neutron-diffraction data, ab-initio molecular dynamics simulations, and the atomic probe microscopy.

  17. Local structures of high-entropy alloys (HEAs) on atomic scales: An overview

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Diao, Haoyan; Santodonato, Louis J.; Tang, Zhi; Egami, Takeshi; Liaw, Peter K.

    2015-01-01

    The high-entropy alloys, containing several elements mixed in equimolar or near-equimolar ratios, have shown exceptional engineering properties. Local structures on the atomic level are essential to understand the mechanical behaviors and related mechanisms. This article covers the local structure and stress on the atomic level are reviewed by the pair-distribution function of neutron-diffraction data, ab-initio molecular dynamics simulations, and the atomic probe microscopy.

  18. Sandia Energy - Sandia-California Partners with Japanese National...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Dr. An is an internationally recognized expert on scanning probe microscopy, such as atomic force microscopy and scanning tunneling microscopy, and regularly visits...

  19. CNEEC - Atomic Layer Deposition Tutorial by Stacey Bent

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Layer Deposition

  20. Atomizing nozzle and method

    DOE Patents [OSTI]

    Ting, Jason (Ames, IA); Anderson, Iver E. (Ames, IA); Terpstra, Robert L. (Ames, IA)

    2000-03-16

    A high pressure close-coupled gas atomizing nozzle includes multiple discrete gas jet discharge orifices having aerodynamically designed convergent-divergent geometry with an first converging section communicated to a gas supply manifold and to a diverging section by a constricted throat section to increase atomizing gas velocity. The gas jet orifices are oriented at gas jet apex angle selected relative to the melt supply tip apex angle to establish a melt aspiration condition at the melt supply tip.

  1. Optical atomic magnetometer

    DOE Patents [OSTI]

    Budker, Dmitry; Higbie, James; Corsini, Eric P

    2013-11-19

    An optical atomic magnetometers is provided operating on the principles of nonlinear magneto-optical rotation. An atomic vapor is optically pumped using linearly polarized modulated light. The vapor is then probed using a non-modulated linearly polarized light beam. The resulting modulation in polarization angle of the probe light is detected and used in a feedback loop to induce self-oscillation at the resonant frequency.

  2. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Record-Setting Microscopy Illuminates Energy Storage Materials Print Thursday, 22 January 2015 12:10 X-ray microscopy...

  3. EUV Dark-Field Microscopy for Defect Inspection

    SciTech Connect (OSTI)

    Juschkin, L.; Maryasov, A.; Herbert, S.; Aretz, A.; Bergmann, K.; Lebert, R.

    2011-09-09

    An actinic EUV microscope for defect detection on mask blanks for operation in dark field using a table-top discharge-produced plasma source has been developed. Several test structures (pits and bumps) on multilayer mirrors were investigated by our Schwarzschild objective-based EUV microscope at 13.5-nm wavelength and then characterized with an atomic force microscope. Possible defect-detection limits with large field of view and moderate magnification are discussed in terms of required irradiation dose and system performance.

  4. Scanning probe microscopy competency development

    SciTech Connect (OSTI)

    Hawley, M.E.; Reagor, D.W.; Jia, Quan Xi

    1998-12-31

    This is the final report of a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The project collaborators developed an ultra-high vacuum scanning tunneling microscope (UHV-STM) capability, integrated it with existing scanning probe microscopes, and developed new, advanced air-based scanning force techniques (SPMs). Programmatic, basic, and industrially related laboratory research requires the existence of SPMs, as well as expertise capable of providing local nano-scale information. The UHV-STM capability, equipped with load-lock system and several surface science techniques, will allow introduction, examination, and reaction of surfaces prepared under well-controlled vacuum conditions, including the examination of morphology and local bonding associated with the initial stages of film growth under controlled growth conditions. The resulting capabilities will enable the authors to respond to a variety of problems requiring local characterization of conducting and nonconducting surfaces in liquids, air, and UHV.

  5. Electron Microscopy Center | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Electron Microscopy Center The Electron Microscopy Center Group (EMC) develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials challenges. EMC emphasizes three major areas: materials research, experimental technique and instrumentation development, and operation of unique and state-of-the-art instrumentation. The goals of EMC materials research are closely aligned with those of our user community.

  6. NREL: Measurements and Characterization - Scanning Electron Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Researcher using field-emission scanning electron microscope. Field emission scanning electron microscope (FE-SEM) JEOL 6320F. This FE-SEM equipped with a cold field-emission source and in-lens detectors is designed for ultra-high resolution at low accelerating voltage. Compositional mapping by energy-dispersive microscopy and Electron Backscattered Diffraction are available. In basic scanning electron microscopy (SEM), a beam of highly energetic (0.1-50 keV) electrons is

  7. General Atomics (GA) | Princeton Plasma Physics Lab

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    General Atomics (GA) Subscribe to RSS - General Atomics (GA) General Atomics Image: General Atomics (GA) The Scorpion's Strategy: "Catch and Subdue" Read more about The Scorpion's...

  8. The Harnessed Atom | Department of Energy

    Office of Environmental Management (EM)

    The Harnessed Atom The Harnessed Atom The Harnessed Atom The Harnessed Atom is a new middle school science, technology, engineering, and math (STEM) curriculum extension...

  9. Work Force Restructuring Activities

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Work Force Restructuring Activities December 10, 2008 Note: Current updates are in bold # Planned Site/Contractor HQ Approved Separations Status General * LM has finalized the compilation of contractor management team separation data for the end of FY07 actuals and end of FY08 and FY09 projections. LM has submitted to Congress the FY 2007 Annual Report on contractor work force restructuring activities. The report has been posted to the LM website. *LM conducted a DOE complex-wide data call to

  10. Microscopy (XSD-MIC) | Advanced Photon Source

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    microdiffraction, fluorescence tomography, coherent diffraction, and synchrotron x-ray scanning tunneling microscopy (SX-STM) This website is intended to provide useful...

  11. X-Ray Microscopy | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Microscopy X-Ray Microscopy This group exploits the unique capabilities of hard X-ray microscopy to visualize and understand the structure and behavior of hybrid, energy-related, and tailored nanomaterials The Hard X-Ray Nanoprobe, located at Sector 26 of the Advanced Photon Source (APS) and operated by our group and APS, is the only dedicated X-ray microscopy beamline within the portfolios of the nation's Nanoscale Science Research Centers. Our scientific program seeks to understand

  12. X-ray microscopy. Beyond ensemble averages

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ice, Gene E.; Budai, John D.

    2015-06-23

    This work exemplifies emerging tools to characterize local materials structure and dynamics, made possible by powerful X-ray synchrotron and transmission electron microscopy methods.

  13. Reflected beam illumination microscopy using a microfluidics...

    Office of Scientific and Technical Information (OSTI)

    using a microfluidics device - progress report 6152014. Citation Details In-Document Search Title: Reflected beam illumination microscopy using a microfluidics device - ...

  14. Scientific Achievement Analytical Transmission Electron Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Analytical Transmission Electron Microscopy (TEM) method was developed to determine thickness and wrinkles in electron beam sensitive 2-dimensional (2D) MFI nanosheets....

  15. Variable temperature electrochemical strain microscopy of Sm...

    Office of Scientific and Technical Information (OSTI)

    Sponsoring Org: SC USDOE - Office of Science (SC) Country of Publication: United States Language: English Subject: Solid-oxide fuel cells (SOFC); Electrochemical Strain Microscopy ...

  16. Radiation-thermoacoustic microscopy of condensed media

    SciTech Connect (OSTI)

    Lyamshev, L.M.; Chelnokov, B.I.

    1984-07-01

    Possibilities are discussed for the application of scanning radiation-thermoacoustic microscopy, using different types of radiation, for microstructure analysis. (AIP)

  17. Note: A rigid piezo motor with large output force and an effective method to reduce sliding friction force

    SciTech Connect (OSTI)

    Guo, Ying; Lu, Qingyou; Hou, Yubin

    2014-05-15

    We present a completely practical TunaDrive piezo motor. It consists of a central piezo stack sandwiched by two arm piezo stacks and two leg piezo stacks, respectively, which is then sandwiched and spring-clamped by a pair of parallel polished sapphire rods. It works by alternatively fast expanding and contracting the arm/leg stacks while slowly expanding/contracting the central stack simultaneously. The key point is that sufficiently fast expanding and contracting a limb stack can make its two sliding friction forces well cancel, resulting in the total sliding friction force is <10% of the total static friction force, which can help increase output force greatly. The piezo motor's high compactness, precision, and output force make it perfect in building a high-quality harsh-condition (vibration resistant) atomic resolution scanning probe microscope.

  18. Work Force Discipline

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1983-03-23

    The order provides guidance and procedures and states responsibilities for maintaining work force discipline in DOE. Chg 1, dated 3-11-85; Chg 2, dated 1-6-86; Chg 3, dated 3-21-89; Chg 4, dated 8-2-90; Chg 5, dated 3-9-92; Chg 6, dated 8-21-92, cancels Chg 5.

  19. Protective Force Program

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2000-06-30

    Establishes policy, requirements, responsibilities, and authorities, for the management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Extended until 7-7-06 by DOE N 251.64, dated 7-7-05 Cancels: DOE 5632.7A

  20. Direct Aerosol Forcing Uncertainty

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Mccomiskey, Allison

    2008-01-15

    Understanding sources of uncertainty in aerosol direct radiative forcing (DRF), the difference in a given radiative flux component with and without aerosol, is essential to quantifying changes in Earth's radiation budget. We examine the uncertainty in DRF due to measurement uncertainty in the quantities on which it depends: aerosol optical depth, single scattering albedo, asymmetry parameter, solar geometry, and surface albedo. Direct radiative forcing at the top of the atmosphere and at the surface as well as sensitivities, the changes in DRF in response to unit changes in individual aerosol or surface properties, are calculated at three locations representing distinct aerosol types and radiative environments. The uncertainty in DRF associated with a given property is computed as the product of the sensitivity and typical measurement uncertainty in the respective aerosol or surface property. Sensitivity and uncertainty values permit estimation of total uncertainty in calculated DRF and identification of properties that most limit accuracy in estimating forcing. Total uncertainties in modeled local diurnally averaged forcing range from 0.2 to 1.3 W m-2 (42 to 20%) depending on location (from tropical to polar sites), solar zenith angle, surface reflectance, aerosol type, and aerosol optical depth. The largest contributor to total uncertainty in DRF is usually single scattering albedo; however decreasing measurement uncertainties for any property would increase accuracy in DRF. Comparison of two radiative transfer models suggests the contribution of modeling error is small compared to the total uncertainty although comparable to uncertainty arising from some individual properties.

  1. Contractor Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2008-11-05

    This Manual establishes requirements for the management and operation of the U.S. Department of Energy contractor protective forces. Cancels: DOE M 470.4-3 Chg 1, CRD (Attachment 2) only, except for Section C. Canceled by DOE O 473.3.

  2. Atomic vapor laser isotope separation

    SciTech Connect (OSTI)

    Stern, R.C.; Paisner, J.A.

    1986-08-15

    The atomic vapor laser isotope separation (AVLIS) process for the enrichment of uranium is evaluated. (AIP)

  3. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    (2) ion beams (2) ion implantation (2) quantum dots (2) f noise (1) accelerators (1) atomic and molecular physics amplifiers (1) atomic force microscopy (1) atoms (1) ...

  4. Iowa Powder Atomization Technologies

    SciTech Connect (OSTI)

    2012-01-01

    The same atomization effect seen in a fuel injector is being applied to titanium metal resulting in fine titanium powders that are less than half the width of a human hair. Titanium melts above 3,000°F and is highly corrosive therefore requiring specialized containers. The liquid titanium is poured through an Ames Laboratory - USDOE patented tube which is intended to increase the energy efficiency of the atomization process, which has the ability to dramatically decrease the cost of fine titanium powders. This novel process could open markets for green manufacturing of titanium components from jet engines to biomedical implants.

  5. Iowa Powder Atomization Technologies

    ScienceCinema (OSTI)

    None

    2013-03-01

    The same atomization effect seen in a fuel injector is being applied to titanium metal resulting in fine titanium powders that are less than half the width of a human hair. Titanium melts above 3,000°F and is highly corrosive therefore requiring specialized containers. The liquid titanium is poured through an Ames Laboratory - USDOE patented tube which is intended to increase the energy efficiency of the atomization process, which has the ability to dramatically decrease the cost of fine titanium powders. This novel process could open markets for green manufacturing of titanium components from jet engines to biomedical implants.

  6. Microscopy & microanalysis 2016 in Columbus, Ohio

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Michael, Joseph R.

    2016-01-08

    The article provides information about an upcoming conference from the program chair. The Microscopy Society of America (MSA), the Microanalysis Society (MAS), and the International Metallographic Society (IMS) invite participation in Microscopy & Microanalysis 2016 in Columbus, Ohio, July 24 through July 28, 2016.

  7. INL Laboratory Scale Atomizer

    SciTech Connect (OSTI)

    C.R. Clark; G.C. Knighton; R.S. Fielding; N.P. Hallinan

    2010-01-01

    A laboratory scale atomizer has been built at the Idaho National Laboratory. This has proven useful for laboratory scale tests and has been used to fabricate fuel used in the RERTR miniplate experiments. This instrument evolved over time with various improvements being made ‘on the fly’ in a trial and error process.

  8. Atom chip apparatus for experiments with ultracold rubidium and potassium gases

    SciTech Connect (OSTI)

    Ivory, M. K.; Ziltz, A. R.; Fancher, C. T.; Pyle, A. J.; Sensharma, A.; Chase, B.; Field, J. P.; Garcia, A.; Aubin, S.; Jervis, D.

    2014-04-15

    We present a dual chamber atom chip apparatus for generating ultracold {sup 87}Rb and {sup 39}K atomic gases. The apparatus produces quasi-pure Bose-Einstein condensates of 10{sup 4} {sup 87}Rb atoms in an atom chip trap that features a dimple and good optical access. We have also demonstrated production of ultracold {sup 39}K and subsequent loading into the chip trap. We describe the details of the dual chamber vacuum system, the cooling lasers, the magnetic trap, the multicoil magnetic transport system, the atom chip, and two optical dipole traps. Due in part to the use of light-induced atom desorption, the laser cooling chamber features a sufficiently good vacuum to also support optical dipole trap-based experiments. The apparatus is well suited for studies of atom-surface forces, quantum pumping and transport experiments, atom interferometry, novel chip-based traps, and studies of one-dimensional many-body systems.

  9. Force Modulator System

    SciTech Connect (OSTI)

    Redmond Clark

    2009-04-30

    Many metal parts manufacturers use large metal presses to shape sheet metal into finished products like car body parts, jet wing and fuselage surfaces, etc. These metal presses take sheet metal and - with enormous force - reshape the metal into a fully formed part in a manner of seconds. Although highly efficient, the forces involved in forming metal parts also damage the press itself, limit the metals used in part production, slow press operations and, when not properly controlled, cause the manufacture of large volumes of defective metal parts. To date, the metal-forming industry has not been able to develop a metal-holding technology that allows full control of press forces during the part forming process. This is of particular importance in the automotive lightweighting efforts under way in the US automotive manufacturing marketplace. Metalforming Controls Technology Inc. (MC2) has developed a patented press control system called the Force Modulator that has the ability to control these press forces, allowing a breakthrough in stamping process control. The technology includes a series of hydraulic cylinders that provide controlled tonnage at all points in the forming process. At the same time, the unique cylinder design allows for the generation of very high levels of clamping forces (very high tonnages) in very small spaces; a requirement for forming medium and large panels out of HSS and AHSS. Successful production application of these systems testing at multiple stamping operations - including Ford and Chrysler - has validated the capabilities and economic benefits of the system. Although this technology has been adopted in a number of stamping operations, one of the primary barriers to faster adoption and application of this technology in HSS projects is system cost. The cost issue has surfaced because the systems currently in use are built for each individual die as a custom application, thus driving higher tooling costs. This project proposed to better

  10. Ultracold Atoms: How Quantum Field Theory Invaded Atomic Physics

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Ultracold Atoms: How Quantum Field Theory Invaded Atomic Physics Eric Braaten Ohio State University May 6, 2015 4:00 p.m. (coffee @ 3:30) The development of the technology for trapping atoms and cooling them to ultralow temperatures gave birth to a new subfield of atomic physics. It also led to the introduction of new theoretical methods into atomic physics, I n particular quantum field theory (QFT). Methods of QFT developed in high energy physics have proved to be very useful in ultracold atom

  11. TEXT Pro Force Training

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Basic Protective Force Training Program DOE/IG-0641 March 2004 * None of the 10 sites included instruction in rappelling even though it was part of the special response team core curriculum and continued to be offered by the Nonprolif- eration and National Security Institute; * Only one site conducted basic training on use of a shotgun, despite the fact that a num- ber of sites used the weapon for breaching exercises and other purposes; and, * Seven of the sites modified prescribed training

  12. ARMY SERVICE FORCES

    Office of Legacy Management (LM)

    ARMY SERVICE FORCES ' -, 1 MANHATTAN ENGINEER DISTRICT --t 4 IN "LPLI RC,' LR io EIDM CIS INTELLIGENCE AND SECURITY DIVISION CHICAGO BRANCH OFFICE i ., -,* - P. 0. Box 6770-A I ' 1 .' CHICAGO 80. ILLINOIS /lvb 15 February 1945 Subject: shipment Security Survey at &Uinckrodt Chemical Works. MEMORANDUM to the Officer in Charge. 1. The Mallinckrodt Chemical Works, St. Louis, Missouri, was contacted by the undersigned on 16 November 1944, for the purpose of -king an investigation to

  13. Advanced analytical electron microscopy for alkali-ion batteries

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Qian, Danna; Ma, Cheng; Meng, Ying Shirley; More, Karren; Chi, Miaofang

    2015-01-01

    Lithium-ion batteries are a leading candidate for electric vehicle and smart grid applications. However, further optimizations of the energy/power density, coulombic efficiency and cycle life are still needed, and this requires a thorough understanding of the dynamic evolution of each component and their synergistic behaviors during battery operation. With the capability of resolving the structure and chemistry at an atomic resolution, advanced analytical transmission electron microscopy (AEM) is an ideal technique for this task. The present review paper focuses on recent contributions of this important technique to the fundamental understanding of the electrochemical processes of battery materials. A detailed reviewmore » of both static (ex situ) and real-time (in situ) studies will be given, and issues that still need to be addressed will be discussed.« less

  14. Advanced analytical electron microscopy for alkali-ion batteries

    SciTech Connect (OSTI)

    Qian, Danna; Ma, Cheng; Meng, Ying Shirley; More, Karren; Chi, Miaofang

    2015-01-01

    Lithium-ion batteries are a leading candidate for electric vehicle and smart grid applications. However, further optimizations of the energy/power density, coulombic efficiency and cycle life are still needed, and this requires a thorough understanding of the dynamic evolution of each component and their synergistic behaviors during battery operation. With the capability of resolving the structure and chemistry at an atomic resolution, advanced analytical transmission electron microscopy (AEM) is an ideal technique for this task. The present review paper focuses on recent contributions of this important technique to the fundamental understanding of the electrochemical processes of battery materials. A detailed review of both static (ex situ) and real-time (in situ) studies will be given, and issues that still need to be addressed will be discussed.

  15. A 4 K cryogenic probe for use in magnetic resonance force microscopy experiments

    SciTech Connect (OSTI)

    Smith, Doran D.; Alexson, Dimitri A.; Garbini, Joseph L.

    2013-09-15

    The detailed design of a mechanically detected nuclear magnetic resonance probe using the SPAM (Springiness Preservation by Aligning Magnetization) geometry, operating at 4 K, in vacuum, and a several-Tesla magnetic field is described. The probe head is vibration-isolated well enough from the environment by a three-spring suspension system that the cantilever achieves thermal equilibrium with the environment without the aid of eddy current damping. The probe uses an ultra-soft Si cantilever with a Ni sphere attached to its tip, and magnetic resonance is registered as a change in the resonant frequency of the driven cantilever. The RF system uses frequency sweeps for adiabatic rapid passage using a 500 μm diameter RF coil wound around a sapphire rod. The RF coil and optical fiber of the interferometer used to sense the cantilever's position are both located with respect to the cantilever using a Garbini micropositioner, and the sample stage is mounted on an Attocube nanopositioner.

  16. Magnetic Force Microscopy Study of Zr2Co11 -Based Nanocrystalline Materials: Effect of Mo Addition

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Yue, Lanping; Jin, Yunlong; Zhang, Wenyong; Sellmyer, David J.

    2015-01-01

    Tmore » he addition of Molybdenum was used to modify the nanostructure and enhance coercivity of rare-earth-free Zr2Co11-based nanocrystalline permanent magnets. he effect of Mo addition on magnetic domain structures of melt spun nanocrystalline Zr16Co84-xMox(x=0, 0.5, 1, 1.5, and 2.0) ribbons has been investigated. It was found that magnetic properties and local domain structures are strongly influenced by Mo doping. he coercivity of the samples increases with the increase in Mo content (x≤1.5). he maximum energy product(BH)maxincreases with increasingxfrom 0.5 MGOe forx=0to a maximum value of 4.2 MGOe forx=1.5. he smallest domain size with a relatively short magnetic correlation length of 128 nm and largest root-mean-square phase shiftΦrmsvalue of 0.66° are observed for thex=1.5. he optimal Mo addition promotes magnetic domain structure refinement and thus leads to a significant increase in coercivity and energy product in this sample.« less

  17. Particles and Forces

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Quarks, Gluons, and Co. Meet the Quirky Inhabitants of the Proton Saturday Morning Physics Saturday Morning Physics -- -- Texas A&M University Texas A&M University Dr. Rainer J. Fries February 21, 2009 Quarks, Gluons and Co. 2 Zooming in on the World around us Quarks, Gluons and Co. 3 Atoms Democritus, Greek philosopher ~ 400 B.C: "All matter is made up of very small indivisible elements" He called them 'atomos'. 19 th century chemistry confirms: there are only 92 different

  18. Materials Properties at Internal Interfaces: Fundamental Atomic Issues

    SciTech Connect (OSTI)

    Browning, Nigel

    2014-09-12

    During the course of this research, the microscopy methods were applied to many different systems (see publication list). However, the work can be broadly classified into three main areas: the statistical distribution of grain boundary structures under different doping conditions, the identification of individual dopant atoms in oxide materials, and the evaluation of nucleation and growth processes in liquid and more recently. The main results from each of these efforts will be discussed in the final report.

  19. Lawrenciums ionization potential, atom by atom

    SciTech Connect (OSTI)

    Miller, Johanna L.

    2015-06-15

    Researchers in Japan have begun probing the atomic physics of elements that can be produced only in minute quantities.

  20. A microfabricated atomic clock

    SciTech Connect (OSTI)

    Knappe, Svenja; Shah, Vishal; Schwindt, Peter D.D.; Hollberg, Leo; Kitching, John; Liew, Li-Anne; Moreland, John

    2004-08-30

    Fabrication techniques usually applied to microelectromechanical systems (MEMS) are used to reduce the size and operating power of the core physics assembly of an atomic clock. With a volume of 9.5 mm{sup 3}, a fractional frequency instability of 2.5x10{sup -10} at 1 s of integration, and dissipating less than 75 mW of power, the device has the potential to bring atomically precise timing to hand-held, battery-operated devices. In addition, the design and fabrication process allows for wafer-level assembly of the structures, enabling low-cost mass-production of thousands of identical units with the same process sequence, and easy integration with other electronics.

  1. ATOMIC ENERGY COMMISSION

    Office of Legacy Management (LM)

    ' ATOMIC ENERGY COMMISSION Frank K. Pittman, Director, bivisioa of Waste &&gement and s- portation, Headquarters j CONTAMItUTED RX-AEC-OWNED OR LEASED FACILITIES' This memorandum responds to your TWX certain information on the above subject. the documentation necessary to answer your available due to the records disposal vailing at the time of release or From records that are available and from disc&ions with most familiar with the transfer operations, &have the current

  2. New Microscopy Patent Awarded | The Ames Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    New Microscopy Patent Awarded Congratulations to former Ames Laboratory staff Ning Fang and Wei Sun for being awarded a new patent, "Auto-calibrated scanning-angle prism-type total...

  3. High-resolution electron microscopy of advanced materials

    SciTech Connect (OSTI)

    Mitchell, T.E.; Kung, H.H.; Sickafus, K.E.; Gray, G.T. III; Field, R.D.; Smith, J.F.

    1997-11-01

    This final report chronicles a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The High-Resolution Electron Microscopy Facility has doubled in size and tripled in quality since the beginning of the three-year period. The facility now includes a field-emission scanning electron microscope, a 100 kV field-emission scanning transmission electron microscope (FE-STEM), a 300 kV field-emission high-resolution transmission electron microscope (FE-HRTEM), and a 300 kV analytical transmission electron microscope. A new orientation imaging microscope is being installed. X-ray energy dispersive spectrometers for chemical analysis are available on all four microscopes; parallel electron energy loss spectrometers are operational on the FE-STEM and FE-HRTEM. These systems enable evaluation of local atomic bonding, as well as chemical composition in nanometer-scale regions. The FE-HRTEM has a point-to-point resolution of 1.6 {angstrom}, but the resolution can be pushed to its information limit of 1 {angstrom} by computer reconstruction of a focal series of images. HRTEM has been used to image the atomic structure of defects such as dislocations, grain boundaries, and interfaces in a variety of materials from superconductors and ferroelectrics to structural ceramics and intermetallics.

  4. Miniature quartz resonator force transducer

    DOE Patents [OSTI]

    EerNisse, E.P.

    The invention relates to a piezoelectric quartz force transducer having the shape of a double-ended tuning fork.

  5. Miniature quartz resonator force transducer

    DOE Patents [OSTI]

    Eer Nisse, Errol P.

    1980-01-01

    The invention relates to a piezoelectric quartz force transducer having the shape of a double-ended tuning fork.

  6. Budget Atomization | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Budget Atomization Budget Atomization Howard Dickenson, Deputy Associate Administrator for Acquisition and Project Management presented on Budget Atomization from the NNSA perspective. Howard presented an overview of the NNSA budget structure and an example of LANL controls. Chris Johns, Director of the Budget Office, DOE Office of the CFO presented on Budget Atomization from the DOE perspective. Chris provided an overview of funding, provided examples, and demonstrated the effect on labs/sites.

  7. Force-Field Parameter Fitter

    Energy Science and Technology Software Center (OSTI)

    2015-05-27

    ParFit is a flexible and extendable framework and library of classes for fitting force-field parameters to data from high-level ab-initio calculations on the basis of deterministic and stochastic algorithms. Currently, the code is fitting MM3 and Merck force-field parameters but could easily extend to other force-field types.

  8. Atomizer with liquid spray quenching

    DOE Patents [OSTI]

    Anderson, I.E.; Osborne, M.G.; Terpstra, R.L.

    1998-04-14

    Method and apparatus are disclosed for making metallic powder particles wherein a metallic melt is atomized by a rotating disk or other atomizer at an atomizing location in a manner to form molten droplets moving in a direction away from said atomizing location. The atomized droplets pass through a series of thin liquid quenching sheets disposed in succession about the atomizing location with each successive quenching sheet being at an increasing distance from the atomizing location. The atomized droplets are incrementally cooled and optionally passivated as they pass through the series of liquid quenching sheets without distorting the atomized droplets from their generally spherical shape. The atomized, cooled droplets can be received in a chamber having a collection wall disposed outwardly of the series of liquid quenching sheets. A liquid quenchant can be flowed proximate the chamber wall to carry the cooled atomized droplets to a collection chamber where atomized powder particles and the liquid quenchant are separated such that the liquid quenchant can be recycled. 6 figs.

  9. Atomizer with liquid spray quenching

    DOE Patents [OSTI]

    Anderson, Iver E.; Osborne, Matthew G.; Terpstra, Robert L.

    1998-04-14

    Method and apparatus for making metallic powder particles wherein a metallic melt is atomized by a rotating disk or other atomizer at an atomizing location in a manner to form molten droplets moving in a direction away from said atomizing location. The atomized droplets pass through a series of thin liquid quenching sheets disposed in succession about the atomizing location with each successive quenching sheet being at an increasing distance from the atomizing location. The atomized droplets are incrementally cooled and optionally passivated as they pass through the series of liquid quenching sheets without distorting the atomized droplets from their generally spherical shape. The atomized, cooled droplets can be received in a chamber having a collection wall disposed outwardly of the series of liquid quenching sheets. A liquid quenchant can be flowed proximate the chamber wall to carry the cooled atomized droplets to a collection chamber where atomized powder particles and the liquid quenchant are separated such that the liquid quenchant can be recycled.

  10. Surface determination through atomically resolved secondary-electron imaging

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ciston, J.; Brown, H. G.; D’Alfonso, A. J.; Koirala, P.; Ophus, C.; Lin, Y.; Suzuki, Y.; Inada, H.; Zhu, Y.; Allen, L. J.; et al

    2015-06-17

    We report that unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we show a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 x 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our workmore » reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Lastly, dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.« less

  11. Spatially resolved quantitative mapping of thermomechanical properties and phase transition temperatures using scanning probe microscopy

    DOE Patents [OSTI]

    Jesse, Stephen; Kalinin, Sergei V; Nikiforov, Maxim P

    2013-07-09

    An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.

  12. DOE - NNSA/NFO -- Atomic Testing Museum

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    National Atomic Testing Museum NNSANFO Language Options U.S. DOENNSA - Nevada Field Office NATIONAL ATOMIC TESTING MUSEUM Photograph of Atomic Testing Museum The Nevada Test Site ...

  13. Atomic data for fusion

    SciTech Connect (OSTI)

    Hunter, H.T.; Kirkpatrick, M.I.; Alvarez, I.; Cisneros, C.; Phaneuf, R.A.; Barnett, C.F.

    1990-07-01

    This report provides a handbook of recommended cross-section and rate-coefficient data for inelastic collisions between hydrogen, helium and lithium atoms, molecules and ions, and encompasses more than 400 different reactions of primary interest in fusion research. Published experimental and theoretical data have been collected and evaluated, and the recommended data are presented in tabular, graphical and parametrized form. Processes include excitation and spectral line emission, charge exchange, ionization, stripping, dissociation and particle interchange reactions. The range of collision energies is appropriate to applications in fusion-energy research.

  14. Normal Force and Drag Force in Magnetorheological Finishing

    SciTech Connect (OSTI)

    Miao, C.; Shafrir, S.N.; Lambropoulos, J.C.; Jacobs, S.D.

    2010-01-13

    The material removal in magnetorheological finishing (MRF) is known to be controlled by shear stress, tau, which equals drag force, Fd, divided by spot area, As. However, it is unclear how the normal force, Fn, affects the material removal in MRF and how the measured ratio of drag force to normal force Fd/Fn, equivalent to coefficient of friction, is related to material removal. This work studies, for the first time for MRF, the normal force and the measured ratio Fd/Fn as a function of material mechanical properties. Experimental data were obtained by taking spots on a variety of materials including optical glasses and hard ceramics with a spot-taking machine (STM). Drag force and normal force were measured with a dual load cell. Drag force decreases linearly with increasing material hardness. In contrast, normal force increases with hardness for glasses, saturating at high hardness values for ceramics. Volumetric removal rate decreases with normal force across all materials. The measured ratio Fd/Fn shows a strong negative linear correlation with material hardness. Hard materials exhibit a low coefficient of friction. The volumetric removal rate increases with the measured ratio Fd/Fn which is also correlated with shear stress, indicating that the measured ratio Fd/Fn is a useful measure of material removal in MRF.

  15. Seeing through walls at the nanoscale: Microwave microscopy of...

    Office of Scientific and Technical Information (OSTI)

    Seeing through walls at the nanoscale: Microwave microscopy of enclosed objects and ... Title: Seeing through walls at the nanoscale: Microwave microscopy of enclosed objects and ...

  16. Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    High Resolution Electron Microscopy for Catalyst Characterization Ultra-High Resolution Electron Microscopy for Catalyst Characterization 2011 DOE Hydrogen and Fuel Cells Program, ...

  17. Ultra-high Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    high Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst Characterization 2009 DOE Hydrogen Program and Vehicle ...

  18. In-Situ Electron Microscopy of Electrical Energy Storage Materials...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    More Documents & Publications In-Situ Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials Investigations ...

  19. In-Situ Electron Microscopy of Electrical Energy Storage Materials...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    More Documents & Publications In-Situ Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials In-situ ...

  20. High-Resolution Photocurrent Microscopy Using Near-FieldCathodolumine...

    Office of Scientific and Technical Information (OSTI)

    High-Resolution Photocurrent Microscopy Using Near-Field Cathodoluminescence of Quantum Dots. Citation Details In-Document Search Title: High-Resolution Photocurrent Microscopy ...

  1. In Situ Transmission Electron Microscopy. (Conference) | SciTech...

    Office of Scientific and Technical Information (OSTI)

    In Situ Transmission Electron Microscopy. Citation Details In-Document Search Title: In Situ Transmission Electron Microscopy. Abstract not provided. Authors: Jungjohann, Katherine ...

  2. Ultra-High Resolution Electron Microscopy for Catalyst Characterizatio...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    pm029allard2010p.pdf More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst...

  3. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is ... removed the resolution limit imposed by the characteristics of the x-ray optics. ...

  4. Subangstrom Edge Relaxations Probed by Electron Microscopy in...

    Office of Scientific and Technical Information (OSTI)

    Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride Title: Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride ...

  5. Orientation imaging microscopy of polycrystalline sodium chloride

    SciTech Connect (OSTI)

    Staiger, M.P.; Kolbeinsson, I.; Newman, J.; Woodfield, T.; Sato, T.

    2010-04-15

    A novel preparation technique is described that makes possible grain size analysis of polycrystalline NaCl using orientation imaging microscopy via electron backscatter diffraction (EBSD). The preparation methodology is specifically developed to overcome difficulties in preparing microporous NaCl for microscopy. The grain size and crystallographic texture of polycrystalline NaCl samples, prepared via solution pressure and sintered in the range of 650-780 deg. C, were able to be measured successfully with EBSD. The limitations of the preparation technique for EBSD analysis of NaCl are also discussed.

  6. Portable dual field gradient force multichannel flow cytometer device with a dual wavelength low noise detection scheme

    DOE Patents [OSTI]

    James, Conrad D; Galambos, Paul C; Derzon, Mark S; Graf, Darin C; Pohl, Kenneth R; Bourdon, Chris J

    2012-10-23

    Systems and methods for combining dielectrophoresis, magnetic forces, and hydrodynamic forces to manipulate particles in channels formed on top of an electrode substrate are discussed. A magnet placed in contact under the electrode substrate while particles are flowing within the channel above the electrode substrate allows these three forces to be balanced when the system is in operation. An optical detection scheme using near-confocal microscopy for simultaneously detecting two wavelengths of light emitted from the flowing particles is also discussed.

  7. Air Force Renewable Energy Programs

    Office of Energy Efficiency and Renewable Energy (EERE)

    Presentation covers Air Force Renewable Energy Programs and is given at the Spring 2011 Federal Utility Partnership Working Group (FUPWG) meeting.

  8. Force As A Momentum Current

    SciTech Connect (OSTI)

    Munera, Hector A.

    2010-07-28

    Advantages of a neo-Cartesian approach to classical mechanics are noted. If conservation of linear momentum is the fundamental principle, Newton's three laws become theorems. A minor paradox in static Newtonian mechanics is identified, and solved by reinterpreting force as a current of momentum. Contact force plays the role of a mere midwife in the exchange of momentum; however, force cannot be eliminated from physics because it provides the numerical value for momentum current. In this sense, in a neo-Cartesian formulation of mechanics the concept of force becomes strengthened rather than weakened.

  9. Continuous Forcing Data, Darwin, Australia

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Jakob, Christian

    2010-09-22

    Long term, large scale continuous forcing data set for three complete wet seasons (2004-2005, 2005-2006 and 2006-2007) in Darwin, Australia.

  10. Continuous Forcing Data, Darwin, Australia

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Jakob, Christian

    Long term, large scale continuous forcing data set for three complete wet seasons (2004-2005, 2005-2006 and 2006-2007) in Darwin, Australia.

  11. Army Energy Initiatives Task Force

    Broader source: Energy.gov [DOE]

    Presentation—given at the Fall 2011 Federal Utility Partnership Working Group (FUPWG) meeting—covers the Army Energy Initiatives Task Force.

  12. HRTEM Imaging of Atoms at Sub-Angstrom Resolution

    SciTech Connect (OSTI)

    O'Keefe, Michael A.; Allard, Lawrence F.; Blom, Douglas A.

    2005-04-06

    John Cowley and his group at Arizona State University pioneered the use of transmission electron microscopy (TEM) for high-resolution imaging. Images were achieved three decades ago showing the crystal unit cell content at better than 4 Angstrom resolution. This achievement enabled researchers to pinpoint the positions of heavy atom columns within the unit cell. Lighter atoms appear as resolution is improved to sub-Angstrom levels. Currently, advanced microscopes can image the columns of the light atoms (carbon, oxygen, nitrogen) that are present in many complex structures, and even the lithium atoms present in some battery materials. Sub-Angstrom imaging, initially achieved by focal-series reconstruction of the specimen exit surface wave, will become common place for next-generation electron microscopes with CS-corrected lenses and monochromated electron beams. Resolution can be quantified in terms of peak separation and inter-peak minimum, but the limits imposed on the attainable resolution by the properties of the micro-scope specimen need to be considered. At extreme resolution the ''size'' of atoms can mean that they will not be resolved even when spaced farther apart than the resolution of the microscope.

  13. General Atomics | Open Energy Information

    Open Energy Info (EERE)

    Product: General Atomics offers research, development and consulting services to the nuclear industry, including nuclear energy production, manufacturing, defense and related...

  14. Plasmonic Three-Dimensional Transparent Conductor Based on Al-Doped Zinc Oxide-Coated Nanostructured Glass Using Atomic Layer Deposition

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Malek, Gary A.; Aytug, Tolga; Liu, Qingfeng; Wu, Judy

    2015-04-02

    Transparent nanostructured glass coatings, fabricated on glass substrates, with a unique three-dimensional (3D) architecture were utilized as the foundation for the design of plasmonic 3D transparent conductors. Transformation of the non-conducting 3D structure to a conducting 3D network was accomplished through atomic layer deposition of aluminum-doped zinc oxide (AZO). After AZO growth, gold nanoparticles (AuNPs) were deposited by electronbeam evaporation to enhance light trapping and decrease the overall sheet resistance. Field emission scanning electron microscopy and atomic force microcopy images revealed the highly porous, nanostructured morphology of the AZO coated glass surface along with the in-plane dimensions of the depositedmore » AuNPs. Sheet resistance measurements conducted on the coated samples verified that the electrical properties of the 3D network are comparable to that of the untextured two-dimensional AZO coated glass substrates. In addition, transmittance measurements of the glass samples coated with various AZO thicknesses showed preservation of the highly transparent nature of each sample, while the AuNPs demonstrated enhanced light scattering as well as light-trapping capability.« less

  15. Plasmonic Three-Dimensional Transparent Conductor Based on Al-Doped Zinc Oxide-Coated Nanostructured Glass Using Atomic Layer Deposition

    SciTech Connect (OSTI)

    Malek, Gary A.; Aytug, Tolga; Liu, Qingfeng; Wu, Judy

    2015-04-02

    Transparent nanostructured glass coatings, fabricated on glass substrates, with a unique three-dimensional (3D) architecture were utilized as the foundation for the design of plasmonic 3D transparent conductors. Transformation of the non-conducting 3D structure to a conducting 3D network was accomplished through atomic layer deposition of aluminum-doped zinc oxide (AZO). After AZO growth, gold nanoparticles (AuNPs) were deposited by electronbeam evaporation to enhance light trapping and decrease the overall sheet resistance. Field emission scanning electron microscopy and atomic force microcopy images revealed the highly porous, nanostructured morphology of the AZO coated glass surface along with the in-plane dimensions of the deposited AuNPs. Sheet resistance measurements conducted on the coated samples verified that the electrical properties of the 3D network are comparable to that of the untextured two-dimensional AZO coated glass substrates. In addition, transmittance measurements of the glass samples coated with various AZO thicknesses showed preservation of the highly transparent nature of each sample, while the AuNPs demonstrated enhanced light scattering as well as light-trapping capability.

  16. Manipulation of polystyrene nanoparticles on a silicon wafer in the peak force tapping mode in water: pH-dependent friction and adhesion force

    SciTech Connect (OSTI)

    Schiwek, Simon; Stark, Robert W. E-mail: dietz@csi.tu-darmstadt.de; Dietz, Christian E-mail: dietz@csi.tu-darmstadt.de; Heim, Lars-Oliver

    2015-03-14

    The friction force between nanoparticles and a silicon wafer is a crucial parameter for cleaning processes in the semiconductor industry. However, little is known about the pH-dependency of the friction forces and the shear strength at the interface. Here, we push polystyrene nanoparticles, 100 nm in diameter, with the tip of an atomic force microscope and measure the pH-dependency of the friction, adhesion, and normal forces on a silicon substrate covered with a native silicon dioxide layer. The peak force tapping mode was applied to control the vertical force on these particles. We successively increased the applied load until the particles started to move. The main advantage of this technique over single manipulation processes is the achievement of a large number of manipulation events in short time and in a straightforward manner. Geometrical considerations of the interaction forces at the tip-particle interface allowed us to calculate the friction force and shear strength from the applied normal force depending on the pH of an aqueous solution. The results clearly demonstrated that particle removal should be performed with a basic solution at pH 9 because of the low interaction forces between particle and substrate.

  17. Alternative method to control radiative vortex forces in a magneto-optical trap

    SciTech Connect (OSTI)

    Kiersnowski, K.; Kawalec, T.; Dohnalik, T.

    2006-06-15

    We present an experimental and theoretical study of controlling the atomic spatial distributions in a magneto-optical trap (MOT). With a diaphragm we can vary the waist and power of one of the cooling laser beams and we can change parameters of large-diameter, parallelogram-shaped atomic orbits. We show that the radiative force generated by the repumping MOT laser has to be taken into consideration. Computer simulations of atomic trajectories explain the observed spatial structures, and we employ these simulations to present potential applications of controlling the diaphragm diameter as a function of time. A potential use of controlled vortex forces seems to have a great significance in recently presented important new methods to investigate cold atom collisions in the MOT, which were recently published.

  18. The Atomic City / The Magic of the Atom - 1950's Atomic Energy Commission Documentary

    ScienceCinema (OSTI)

    None

    2014-07-31

    The story of American cities located near atomic power plants, and steps taken monitoring radiation to ensure the safety of the public who live nearby. .

  19. The Atomic City / The Magic of the Atom - 1950's Atomic Energy Commission Documentary

    SciTech Connect (OSTI)

    2012-06-04

    The story of American cities located near atomic power plants, and steps taken monitoring radiation to ensure the safety of the public who live nearby. .

  20. Low-temperature atomic layer deposition of Al{sub 2}O{sub 3} on blown polyethylene films with plasma-treated surfaces

    SciTech Connect (OSTI)

    Beom Lee, Gyeong; Sik Son, Kyung; Won Park, Suk; Hyung Shim, Joon; Choi, Byoung-Ho

    2013-01-15

    In this study, a layer of Al{sub 2}O{sub 3} was deposited on blown polyethylene films by atomic layer deposition (ALD) at low temperatures, and the surface characteristics of these Al{sub 2}O{sub 3}-coated blown polyethylene films were analyzed. In order to examine the effects of the plasma treatment of the surfaces of the blown polyethylene films on the properties of the films, both untreated and plasma-treated film samples were prepared under various processing conditions. The surface characteristics of the samples were determined by x-ray photoelectron spectroscopy, as well as by measuring their surface contact angles. It was confirmed that the surfaces of the plasma-treated samples contained a hydroxyl group, which helped the precursor and the polyethylene substrate to bind. ALD of Al{sub 2}O{sub 3} was performed through sequential exposures to trimethylaluminum and H{sub 2}O at 60 Degree-Sign C. The surface morphologies of the Al{sub 2}O{sub 3}-coated blown polyethylene films were observed using atomic force microscopy and scanning electron microscopy/energy-dispersive x-ray spectroscopy. Further, it was confirmed that after ALD, the surface of the plasma-treated film was covered with alumina grains more uniformly than was the case for the surface of the untreated polymer film. It was also confirmed via the focused ion beam technique that the layer Al{sub 2}O{sub 3} conformed to the surface of the blown polyethylene film.

  1. Tools for macromolecular model building and refinement into electron cryo-microscopy reconstructions

    SciTech Connect (OSTI)

    Brown, Alan; Long, Fei; Nicholls, Robert A.; Toots, Jaan; Emsley, Paul; Murshudov, Garib, E-mail: garib@mrc-lmb.cam.ac.uk [MRC Laboratory of Molecular Biology, Francis Crick Avenue, Cambridge CB2 0QH (United Kingdom)

    2015-01-01

    A description is given of new tools to facilitate model building and refinement into electron cryo-microscopy reconstructions. The recent rapid development of single-particle electron cryo-microscopy (cryo-EM) now allows structures to be solved by this method at resolutions close to 3 . Here, a number of tools to facilitate the interpretation of EM reconstructions with stereochemically reasonable all-atom models are described. The BALBES database has been repurposed as a tool for identifying protein folds from density maps. Modifications to Coot, including new Jiggle Fit and morphing tools and improved handling of nucleic acids, enhance its functionality for interpreting EM maps. REFMAC has been modified for optimal fitting of atomic models into EM maps. As external structural information can enhance the reliability of the derived atomic models, stabilize refinement and reduce overfitting, ProSMART has been extended to generate interatomic distance restraints from nucleic acid reference structures, and a new tool, LIBG, has been developed to generate nucleic acid base-pair and parallel-plane restraints. Furthermore, restraint generation has been integrated with visualization and editing in Coot, and these restraints have been applied to both real-space refinement in Coot and reciprocal-space refinement in REFMAC.

  2. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    M Abstract not provided. October 2013 Nanoscale in-situ atomic force microscopy studies ... September 2013 Seeing through walls at the nanoscale: Microwave microscopy of enclosed ...

  3. Orderly Deposition of Uncontaminated Graphene - Energy Innovation...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    These structures were visualized with scanning electron microscopy and atomic force microscopy, and their graphene composition was confirmed with Raman spectroscopy. The nanolines ...

  4. --No Title--

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    beam method. The as-grown devices are imaged by scanning electron microscopy, and atomic force microscopy is used to determine the carbon nanotube diameter distribution....

  5. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    ... These structures were characterized by atomic force microscopy. Vertically gated ... Transmission electron microscopy and x-ray diffraction were used to assess the ...

  6. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    ... Cross-sectional transmission electron microscopy and atomic force microscopy studies show high crystalline quality and smooth surface morphology. X-ray diffraction investigations ...

  7. In-situ control system for atomization

    DOE Patents [OSTI]

    Anderson, I.E.; Figliola, R.S.; Terpstra, R.L.

    1995-06-13

    Melt atomizing apparatus comprising a melt supply orifice for supplying the melt for atomization and gas supply orifices proximate the melt supply orifice for supplying atomizing gas to atomize the melt as an atomization spray is disclosed. The apparatus includes a sensor, such as an optical and/or audio sensor, for providing atomization spray data, and a control unit responsive to the sensed atomization spray data for controlling at least one of the atomizing gas pressure and an actuator to adjust the relative position of the gas supply orifice and melt supply in a manner to achieve a desired atomization spray. 3 figs.

  8. In-situ control system for atomization

    DOE Patents [OSTI]

    Anderson, Iver E.; Figliola, Richard S.; Terpstra, Robert L.

    1995-06-13

    Melt atomizing apparatus comprising a melt supply orifice for supplying the melt for atomization and gas supply orifices proximate the melt supply orifice for supplying atomizing gas to atomize the melt as an atomization spray. The apparatus includes a sensor, such as an optical and/or audio sensor, for providing atomization spray data, and a control unit responsive to the sensed atomization spray data for controlling at least one of the atomizing gas pressure and an actuator to adjust the relative position of the gas supply orifice and melt supply in a manner to achieve a desired atomization spray.

  9. Sub-microsecond-resolution probe microscopy

    DOE Patents [OSTI]

    Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

    2014-04-01

    Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

  10. Supersonic coal water slurry fuel atomizer

    DOE Patents [OSTI]

    Becker, Frederick E.; Smolensky, Leo A.; Balsavich, John

    1991-01-01

    A supersonic coal water slurry atomizer utilizing supersonic gas velocities to atomize coal water slurry is provided wherein atomization occurs externally of the atomizer. The atomizer has a central tube defining a coal water slurry passageway surrounded by an annular sleeve defining an annular passageway for gas. A converging/diverging section is provided for accelerating gas in the annular passageway to supersonic velocities.

  11. Atomic charges for modeling metal–organic frameworks: Why and how

    SciTech Connect (OSTI)

    Hamad, Said Balestra, Salvador R.G.; Bueno-Perez, Rocio; Calero, Sofia; Ruiz-Salvador, A. Rabdel

    2015-03-15

    Atomic partial charges are parameters of key importance in the simulation of Metal–Organic Frameworks (MOFs), since Coulombic interactions decrease with the distance more slowly than van der Waals interactions. But despite its relevance, there is no method to unambiguously assign charges to each atom, since atomic charges are not quantum observables. There are several methods that allow the calculation of atomic charges, most of them starting from the electronic wavefunction or the electronic density or the system, as obtained with quantum mechanics calculations. In this work, we describe the most common methods employed to calculate atomic charges in MOFs. In order to show the influence that even small variations of structure have on atomic charges, we present the results that we obtained for DMOF-1. We also discuss the effect that small variations of atomic charges have on the predicted structural properties of IRMOF-1. - Graphical abstract: We review the different method with which to calculate atomic partial charges that can be used in force field-based calculations. We also present two examples that illustrate the influence of the geometry on the calculated charges and the influence of the charges on structural properties. - Highlights: • The choice of atomic charges is crucial in modeling adsorption and diffusion in MOFs. • Methods for calculating atomic charges in MOFs are reviewed. • We discuss the influence of the framework geometry on the calculated charges. • We discuss the influence of the framework charges on structural the properties.

  12. Programming new geometry restraints: Parallelity of atomic groups

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Sobolev, Oleg V.; Afonine, Pavel V.; Adams, Paul D.; Urzhumtsev, Alexandre

    2015-08-01

    Improvements in structural biology methods, in particular crystallography and cryo-electron microscopy, have created an increased demand for the refinement of atomic models against low-resolution experimental data. One way to compensate for the lack of high-resolution experimental data is to use a priori information about model geometry that can be utilized in refinement in the form of stereochemical restraints or constraints. Here, the definition and calculation of the restraints that can be imposed on planar atomic groups, in particular the angle between such groups, are described. Detailed derivations of the restraint targets and their gradients are provided so that they canmore » be readily implemented in other contexts. Practical implementations of the restraints, and of associated data structures, in the Computational Crystallography Toolbox(cctbx) are presented.« less

  13. Programming new geometry restraints: Parallelity of atomic groups

    SciTech Connect (OSTI)

    Sobolev, Oleg V.; Afonine, Pavel V.; Adams, Paul D.; Urzhumtsev, Alexandre

    2015-08-01

    Improvements in structural biology methods, in particular crystallography and cryo-electron microscopy, have created an increased demand for the refinement of atomic models against low-resolution experimental data. One way to compensate for the lack of high-resolution experimental data is to use a priori information about model geometry that can be utilized in refinement in the form of stereochemical restraints or constraints. Here, the definition and calculation of the restraints that can be imposed on planar atomic groups, in particular the angle between such groups, are described. Detailed derivations of the restraint targets and their gradients are provided so that they can be readily implemented in other contexts. Practical implementations of the restraints, and of associated data structures, in the Computational Crystallography Toolbox(cctbx) are presented.

  14. Electrohydrodynamic atomization (EHDA) assisted wet chemical synthesis of nickel nanoparticles

    SciTech Connect (OSTI)

    Barzegar Vishlaghi, M. [Department of Mechanical Engineering, University of Tabriz, Tabriz (Iran, Islamic Republic of)] [Department of Mechanical Engineering, University of Tabriz, Tabriz (Iran, Islamic Republic of); Farzalipour Tabriz, M., E-mail: meisam.fa@gmail.com [Department of Mechanical Engineering, University of Tabriz, Tabriz (Iran, Islamic Republic of); Mohammad Moradi, O. [Department of Mechanical Engineering, University of Tabriz, Tabriz (Iran, Islamic Republic of)] [Department of Mechanical Engineering, University of Tabriz, Tabriz (Iran, Islamic Republic of)

    2012-07-15

    Highlights: ? Electrohydrodynamic atomization (EHDA) assisted chemical synthesis of nickel nanoparticles is reported. ? Substituting water with non-aqueous media prevents the formation of nickel hydroxide. ? Size of particles decreased from 10 to 20 nm down to 24 nm by using multi-jet mode. ? Synthesized nanoparticles have diffraction patterns similar to amorphous materials. -- Abstract: In this study nickel nanoparticles were prepared via chemical reduction of nickel acetate using sodium borohydride using electrohydrodynamic atomization (EHDA) technique. This technique was used to spray a finely dispersed aerosol of nickel precursor solution into the reductive bath. Obtained particles were characterized by means of X-ray diffraction (XRD), UVVisible spectroscopy, and transmission electron microscopy (TEM). Results confirmed the formation of nickel nanoparticles and showed that applying EHDA technique to chemical reduction method results in producing smaller particles with narrower size distribution in comparison with conventional reductive precipitation method.

  15. Direct visualization of atomically precise nitrogen-doped graphene nanoribbons

    SciTech Connect (OSTI)

    Zhang, Yi; Zhang, Yanfang; Li, Geng; Lu, Jianchen; Du, Shixuan, E-mail: sxdu@iphy.ac.cn, E-mail: feng@mpip-mainz.mpg.de; Gao, Hong-Jun [Institute of Physics and University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100190 (China); Lin, Xiao [University of Chinese Academy of Sciences and Institute of Physics, Chinese Academy of Sciences, Beijing 100049 (China); Berger, Reinhard; Feng, Xinliang, E-mail: sxdu@iphy.ac.cn, E-mail: feng@mpip-mainz.mpg.de; Mllen, Klaus [Max Planck Institute for Polymer Research, Ackermannweg 10, D-55128 Mainz (Germany)

    2014-07-14

    We have fabricated atomically precise nitrogen-doped chevron-type graphene nanoribbons by using the on-surface synthesis technique combined with the nitrogen substitution of the precursors. Scanning tunneling microscopy and spectroscopy indicate that the well-defined nanoribbons tend to align with the neighbors side-by-side with a band gap of 1.02?eV, which is in good agreement with the density functional theory calculation result. The influence of the high precursor coverage on the quality of the nanoribbons is also studied. We find that graphene nanoribbons with sufficient aspect ratios can only be fabricated at sub-monolayer precursor coverage. This work provides a way to construct atomically precise nitrogen-doped graphene nanoribbons.

  16. Los Alamos National Laboratory ATOMIC PHOTOGRAPHY ATOMIC PHOTOGRAPHY

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ATOMIC PHOTOGRAPHY ATOMIC PHOTOGRAPHY BLASTS FROM THE PAST BLASTS FROM THE PAST Twenty-five U.S. atmospheric nuclear weapons operations (each a series of tests) were conducted from 1945 to 1963, primarily at the Pacific Proving Grounds and at the Nevada Test Site, southeastern Nevada. Below, observers witness Operation Greenhouse, Eniwetok Atoll, spring 1951. Greenhouse was a series of four tests. 17 Proof of principle for thermonuclear weapons, the 225-kiloton George test, May 8, 1951, of

  17. Training program to prepare the U.S. DOE laboratories for the entry into force of the protocol additional to the agreement between the United States of America and the International Atomic Energy Agency for the application of safeguards in the United

    SciTech Connect (OSTI)

    Boyer, Brian David; Stevens, Rebecca C; Uribe, Eva C; Sandoval, M Analisa; Valente, John N; Valente, John U; Jo, Jae H; Sellen, Joana

    2009-01-01

    In 2008, a joint team from Brookhaven National Laboratory (BNL) and Los Alamos National Laboratory (LANL) consisting of specialists in training IAEA inspectors in the use of complementary access activities formulated a training program to prepare the U.S DOE laboratories for the entry into force of the U.S. Additional Protocol. Since the U.S. Additional Protocol would allow for IAEA access to the DOE laboratories under the aegis of complementary access activities, the DOE laboratories would need to prepare for such visits. The goal of the training was to ensure that the DOE laboratories would successfully host an IAEA complementary access. In doing so, the labs must be able to provide the IAEA with the information that the IAEA would need to resolve its questions about the U.S. Declaration and declared activities at the lab, and also protect certain equities, as provided under the U.S. Additional Protocol Article 1.b and c. which set forth a 'National Security Exclusion.' This 'NSE' states that the AP provisions apply within the United States 'excluding only instances where its application would result in access by the Agency to activities with direct national security significance to the United States or to location or information associated with such activities.' These activities are referred to collectively as DNSS-direct national security significance. Furthermore, the U.S. has a specific right to employ managed access, without prejudice to the right under Article 1.b, in connection with activities of DNSS. The provisions in Articles 1.b and 1.c are unique to the U.S. AP, and are additional to the more general right, under Article 7, to use managed access to protect from disclosure proprietary and/or proliferation-sensitive information, and to meet safety and security requirements, that is incorporated directly from the Model Additional Protocol. The BNL-LANL team performed training at Lawrence Livermore National Laboratory, Idaho National Laboratory, and Oak

  18. Integrating atomic layer deposition and ultra-high vacuum physical vapor deposition for in situ fabrication of tunnel junctions

    SciTech Connect (OSTI)

    Elliot, Alan J. E-mail: jwu@ku.edu; Malek, Gary A.; Lu, Rongtao; Han, Siyuan; Wu, Judy Z. E-mail: jwu@ku.edu; Yu, Haifeng; Zhao, Shiping

    2014-07-15

    Atomic Layer Deposition (ALD) is a promising technique for growing ultrathin, pristine dielectrics on metal substrates, which is essential to many electronic devices. Tunnel junctions are an excellent example which require a leak-free, ultrathin dielectric tunnel barrier of typical thickness around 1 nm between two metal electrodes. A challenge in the development of ultrathin dielectric tunnel barriers using ALD is controlling the nucleation of dielectrics on metals with minimal formation of native oxides at the metal surface for high-quality interfaces between the tunnel barrier and metal electrodes. This poses a critical need for integrating ALD with ultra-high vacuum (UHV) physical vapor deposition. In order to address these challenges, a viscous-flow ALD chamber was designed and interfaced to an UHV magnetron sputtering chamber via a load lock. A sample transportation system was implemented for in situ sample transfer between the ALD, load lock, and sputtering chambers. Using this integrated ALD-UHV sputtering system, superconductor-insulator-superconductor (SIS) Nb-Al/Al{sub 2}O{sub 2}/Nb Josephson tunnel junctions were fabricated with tunnel barriers of thickness varied from sub-nm to ?1 nm. The suitability of using an Al wetting layer for initiation of the ALD Al{sub 2}O{sub 3} tunnel barrier was investigated with ellipsometry, atomic force microscopy, and electrical transport measurements. With optimized processing conditions, leak-free SIS tunnel junctions were obtained, demonstrating the viability of this integrated ALD-UHV sputtering system for the fabrication of tunnel junctions and devices comprised of metal-dielectric-metal multilayers.

  19. Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy

    SciTech Connect (OSTI)

    Kovacs, Andras; Ney, A.; Duchamp, Martial; Ney, V.; Boothroyd, Chris; Galindo, Pedro L.; Kaspar, Tiffany C.; Chambers, Scott A.; Dunin-Borkowski, Rafal

    2013-12-23

    We have studied planar defects in epitaxial Co:ZnO dilute magnetic semiconductor thin films deposited on c-plane sapphire (Al2O3) and the Co:ZnO/Al2O3 interface structure at atomic resolution using aberration-corrected transmission electron microscopy (TEM) and electron energy-loss spectroscopy (EELS). Comparing Co:ZnO samples deposited by pulsed laser deposition and reactive magnetron sputtering, both exhibit extrinsic stacking faults, incoherent interface structures, and compositional variations within the first 3-4 Co:ZnO layers at the interface.. In addition, we have measured the local strain which reveals the lattice distortion around the stacking faults.

  20. EMRinger: side chain–directed model and map validation for 3D cryo-electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Barad, Benjamin A.; Echols, Nathaniel; Wang, Ray Yu-Ruei; Cheng, Yifan; DiMaio, Frank; Adams, Paul D.; Fraser, James S.

    2015-08-17

    Advances in high-resolution cryo-electron microscopy (cryo-EM) require the development of validation metrics to independently assess map quality and model geometry. We report that EMRinger is a tool that assesses the precise fitting of an atomic model into the map during refinement and shows how radiation damage alters scattering from negatively charged amino acids. EMRinger (https://github.com/fraser-lab/EMRinger) will be useful for monitoring progress in resolving and modeling high-resolution features in cryo-EM.

  1. Big Data and Deep data in scanning and electron microscopies: functionality from multidimensional data sets

    SciTech Connect (OSTI)

    Belianinov, Alex; Vasudevan, Rama K; Strelcov, Evgheni; Steed, Chad A; Yang, Sang Mo; Tselev, Alexander; Jesse, Stephen; Biegalski, Michael D; Shipman, Galen M; Symons, Christopher T; Borisevich, Albina Y; Archibald, Richard K; Kalinin, Sergei

    2015-01-01

    The development of electron, and scanning probe microscopies in the second half of the twentieth century have produced spectacular images of internal structure and composition of matter with, at nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition and analysis. The progress in imaging technologies in the beginning of the twenty first century has opened the proverbial floodgates of high-veracity information on structure and functionality. High resolution imaging now allows information on atomic positions with picometer precision, allowing for quantitative measurements of individual bond length and angles. Functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this data into physically and chemically relevant information from imaging data.

  2. Directing Matter: Toward Atomic-Scale 3D Nanofabrication

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Jesse, Stephen; Borisevich, Albina Y.; Fowlkes, Jason D.; Lupini, Andrew R.; Rack, Philip D.; Unocic, Raymond R.; Sumpter, Bobby G.; Kalinin, Sergei V.; Belianinov, Alex; Ovchinnikova, Olga S.

    2016-05-16

    Here we report that enabling memristive, neuromorphic, and quantum based computing as well as efficient mainstream energy storage and conversion technologies requires next generation of materials customized at the atomic scale. This requires full control of atomic arrangement and bonding in three dimensions. The last two decades witnessed substantial industrial, academic, and government research efforts directed towards this goal through various lithographies and scanning probe based methods. These technologies emphasize 2D surface structures, with some limited 3D capability. Recently, a range of focused electron and ion based methods have demonstrated compelling alternative pathways to achieving atomically precise manufacturing of 3Dmore » structures in solids, liquids, and at interfaces. Electron and ion microscopies offer a platform that can simultaneously observe dynamic and static structures at the nano and atomic scales, and also induce structural rearrangements and chemical transformation. The addition of predictive modeling or rapid image analytics and feedback enables guiding these in a controlled manner. Here, we review the recent results that used focused electron and ion beams to create free-standing nanoscale 3D structures, radiolysis and the fabrication potential with liquid precursors, epitaxial crystallization of amorphous oxides with atomic layer precision, as well as visualization and control of individual dopant motion within a 3D crystal lattice. These works lay the foundation for new approaches to directing nanoscale level architectures and offer a potential roadmap to full 3D atomic control in materials. Lastly, in this perspective we lay out the gaps that currently constrain the processing range of these platforms, reflect on indirect requirements, such as the integration of large scale data analysis with theory, and discuss future prospects of these technologies.« less

  3. Atomic-scale electrochemistry on the surface of a manganite

    SciTech Connect (OSTI)

    Vasudevan, Rama K; Tselev, Alexander; Baddorf, Arthur P; Kalinin, Sergei V

    2015-01-01

    The doped manganese oxides (manganites) have been widely studied for their colossal magnetoresistive effects, for potential applications in oxide spintronics, electroforming in resistive switching devices, and are materials of choice as cathodes in modern solid oxide fuel cells. However, little experimental knowledge of the dynamics of the surfaces of perovskite manganites at the atomic scale exists. Here, through in-situ scanning tunnelling microscopy (STM), we demonstrate atomic resolution on samples of La0.625Ca0.375MnO3 grown on (001) SrTiO3 by pulsed laser deposition (PLD). Furthermore, by applying triangular DC waveforms of increasing amplitude to the STM tip, and measuring the tunnelling current, we demonstrate the ability to both perform and monitor surface electrochemical processes at the atomic level, including, for the first time in a manganite, formation of single and multiple oxygen vacancies, disruption of the overlying manganite layers, and removal and deposition of individual atomic units or clusters. Our work paves the way for better understanding of surface oxygen reactions in these systems.

  4. Atomic-scale electrochemistry on the surface of a manganite

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Vasudevan, Rama K; Tselev, Alexander; Baddorf, Arthur P; Kalinin, Sergei V

    2015-01-01

    The doped manganese oxides (manganites) have been widely studied for their colossal magnetoresistive effects, for potential applications in oxide spintronics, electroforming in resistive switching devices, and are materials of choice as cathodes in modern solid oxide fuel cells. However, little experimental knowledge of the dynamics of the surfaces of perovskite manganites at the atomic scale exists. Here, through in-situ scanning tunnelling microscopy (STM), we demonstrate atomic resolution on samples of La0.625Ca0.375MnO3 grown on (001) SrTiO3 by pulsed laser deposition (PLD). Furthermore, by applying triangular DC waveforms of increasing amplitude to the STM tip, and measuring the tunnelling current, we demonstratemore » the ability to both perform and monitor surface electrochemical processes at the atomic level, including, for the first time in a manganite, formation of single and multiple oxygen vacancies, disruption of the overlying manganite layers, and removal and deposition of individual atomic units or clusters. Our work paves the way for better understanding of surface oxygen reactions in these systems.« less

  5. ATOMIC ENERGY ACT OF 1946

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    D. Niisc AEC Hcadqoartcrs Library Voliiinc I Principal Docriiiiciits U.S. ATOMIC ENERGY COMMISSION WASHINGTON, 1965 PUBLIC LAW 5 8 5 - 7 9 CONQRESS CHAPTER 724-2 ...

  6. Imaging atoms in 3-D

    ScienceCinema (OSTI)

    Ercius, Peter

    2014-06-27

    Berkeley Lab's Peter Ercius discusses "Imaging atoms in 3-D" in this Oct. 28, 2013 talk, which is part of a Science at the Theater event entitled Eight Big Ideas

  7. Efimov physics in cold atoms

    SciTech Connect (OSTI)

    Braaten, Eric . E-mail: braaten@mps.ohio-state.edu; Hammer, H.-W. . E-mail: hammer@itkp.uni-bonn.de

    2007-01-15

    Atoms with a large scattering length have universal low-energy properties that do not depend on the details of their structure or their interactions at short distances. In the 2-atom sector, the universal properties are familiar and depend only on the scattering length. In the 3-atom sector for identical bosons, the universal properties include the existence of a sequence of shallow triatomic molecules called Efimov trimers and log-periodic dependence of scattering observables on the energy and the scattering length. In this review, we summarize the universal results that are currently known. We also summarize the experimental information that is currently available with an emphasis on 3-atom loss processes.

  8. Theoretical studies of atomic transitions

    SciTech Connect (OSTI)

    Fischer, C.F.

    1990-10-01

    This paper discusses: lifetime of excited states; core-polarization studies; large relativistic calculations; Monte Carlo Hartree-Fock (MCHF) atomic structure package; and MCHF codes for the hypercube. (LSP)

  9. UNITED STATES ATOMIC ENERGY COMMISSION

    Office of Legacy Management (LM)

    I(S.0 -01: SPECIAL NUCLEAR MATERIAL LlCEWSE Pursuant to the Atomic Energy Act of 1954 and Title 10, Code of Federal Regulations, Chapter 1, Part 70, "Special Nuclear Material ...

  10. u. S. Atomic Energy Commission

    Office of Legacy Management (LM)

    S. Atomic Energy Commission R. 0. Box 30, Ansonia Station New York ES, N. Y. MATERIALS 5+k& hJf Reference: SK:BL Attention: Mr. R. J. Smith Jr. Director Special Materials Division ...

  11. Electron Microscopy Center Capabilities | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Capabilities ACAT: Argonne Chromatic Aberration-corrected TEM This FEI Titan 80-300 ST has a CEOS Cc/Cs corrector on the imaging side of the column to correct both spherical and chromatic aberrations. The Cc/Cs corrector also provides greatly-improved resolution and signal for energy filtered imaging and EELS. FEI Tecnai F20ST TEM/STEM This premier analytical transmission electron microscope (AEM) has specialized accessories including an energy-dispersive x-ray

  12. Fast electron microscopy via compressive sensing

    DOE Patents [OSTI]

    Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

    2014-12-09

    Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

  13. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Biological Imaging by Soft X-Ray Diffraction Microscopy Print Wednesday, 30 November 2005 00:00 Electron and x-ray...

  14. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with...

  15. Scanning Photocurrent Microscopy of Si and Ge nanowires (Conference...

    Office of Scientific and Technical Information (OSTI)

    Country of Publication: United States Language: English Subject: 36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; CATALYSTS; DIFFUSION LENGTH; MICROSCOPY; PHOTOCURRENTS; ...

  16. --No Title--

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    8600 "Quantification of Chemical Forces with Picometer Resolution Using Three-Dimensional Atomic Force Microscopy" U.D. Schwarz Department of Mechanical Engineering, Yale...

  17. Atomic vapor laser isotope separation process

    DOE Patents [OSTI]

    Wyeth, Richard W.; Paisner, Jeffrey A.; Story, Thomas

    1990-01-01

    A laser spectroscopy system is utilized in an atomic vapor laser isotope separation process. The system determines spectral components of an atomic vapor utilizing a laser heterodyne technique.

  18. Fundamental Electroweak Studies using Trapped Ions & Atoms

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    collaboration performs fundamental electroweak studies on trapped ions & atoms. We use neutral atom and ion trapping techniques at radioactive ion beam facilities here and...

  19. Manhattan Project: Atomic Discoveries, 1890s-1939

    Office of Scientific and Technical Information (OSTI)

    The exact nature of these atoms remained elusive, however, despite centuries of attempts ... Explorations into the nature of the atom from 1919 to 1932 confirmed this new model, ...

  20. Atomic Photography: Blasts from the Past

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Photography National Security Science Latest Issue:July 2015 past issues All Issues submit Atomic Photography: Blasts from the Past A gallery of images reveals the weird...

  1. Initial validation of FORCE2

    SciTech Connect (OSTI)

    Burge, S.W.

    1991-06-01

    Erosion has been identified as one of the significant design issues in fluid beds. A cooperative R&D venture of industry, research, and government organizations was recently formed to meet the industry need for a better understanding of erosion in fluid beds. Research focussed on bed hydrodynamics, which are considered to be the primary erosion mechanism. As part of this work, ANL developed an analytical model (FLUFIX) for bed hydrodynamics. Partial validation was performed using data from experiments sponsored by the research consortium. Development of a three-dimensional fluid bed hydrodynamic model was part of Asea-Babcock`s in-kind contribution to the R&D venture. This model, FORCE2, was developed by Babcock & Wilcox`s Research and Development Division existing B&W program and on the gas-solids modeling and was based on an existing B&W program and on the gas-solids modeling technology developed by ANL and others. FORCE2 contains many of the features needed to model plant size beds and, therefore can be used along with the erosion technology to assess metal wastage in industrial equipment. As part of the development efforts, FORCE2 was partially validated using ANL`s two-dimensional model, FLUFIX, and experimental data. Time constraints as well as the lack of good hydrodynamic data, particularly at the plant scale, prohibited a complete validation of FORCE2. This report describes this initial validation of FORCE2.

  2. Studying The Kinetics Of Crystalline Silicon Nanoparticle Lithiation With In-Situ Transmission Electron Microscopy

    SciTech Connect (OSTI)

    Mcdowell, Matthew T.; Ryu, Ill; Lee, Seokwoo; Wang, Chong M.; Nix, William D.; Cui, Yi

    2012-11-27

    Silicon is an attractive high-capacity anode material for Li-ion batteries, but a comprehensive understanding of the massive ~300% volume change and fracture during lithiation/delithiation is necessary to reliably employ Si anodes. Here, in-situ transmission electron microscopy (TEM) of the lithiation of crystalline Si nanoparticles reveals that the reaction slows down as it progresses into the particle interior. Analysis suggests that this behavior is due to the influence of mechanical stress at the reaction front on the driving force for the reaction. These experiments give insight into the factors controlling the kinetics of this unique reaction.

  3. DOE Contractor Work Force Restructuring Approval Thresholds

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Contractor Work Force Restructuring Approval Thresholds Up to 100 employees Contractor can ... to provide approval for NNSA work force restructurings in consultation with LM 501 ...

  4. Automatic HTS force measurement instrument

    DOE Patents [OSTI]

    Sanders, Scott T.; Niemann, Ralph C.

    1999-01-01

    A device for measuring the levitation force of a high temperature superconductor sample with respect to a reference magnet includes a receptacle for holding several high temperature superconductor samples each cooled to superconducting temperature. A rotatable carousel successively locates a selected one of the high temperature superconductor samples in registry with the reference magnet. Mechanism varies the distance between one of the high temperature superconductor samples and the reference magnet, and a sensor measures levitation force of the sample as a function of the distance between the reference magnet and the sample. A method is also disclosed.

  5. Automatic HTS force measurement instrument

    DOE Patents [OSTI]

    Sanders, S.T.; Niemann, R.C.

    1999-03-30

    A device is disclosed for measuring the levitation force of a high temperature superconductor sample with respect to a reference magnet includes a receptacle for holding several high temperature superconductor samples each cooled to superconducting temperature. A rotatable carousel successively locates a selected one of the high temperature superconductor samples in registry with the reference magnet. Mechanism varies the distance between one of the high temperature superconductor samples and the reference magnet, and a sensor measures levitation force of the sample as a function of the distance between the reference magnet and the sample. A method is also disclosed. 3 figs.

  6. Atomic memory access hardware implementations

    SciTech Connect (OSTI)

    Ahn, Jung Ho; Erez, Mattan; Dally, William J

    2015-02-17

    Atomic memory access requests are handled using a variety of systems and methods. According to one example method, a data-processing circuit having an address-request generator that issues requests to a common memory implements a method of processing the requests using a memory-access intervention circuit coupled between the generator and the common memory. The method identifies a current atomic-memory access request from a plurality of memory access requests. A data set is stored that corresponds to the current atomic-memory access request in a data storage circuit within the intervention circuit. It is determined whether the current atomic-memory access request corresponds to at least one previously-stored atomic-memory access request. In response to determining correspondence, the current request is implemented by retrieving data from the common memory. The data is modified in response to the current request and at least one other access request in the memory-access intervention circuit.

  7. Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ophus, Colin; Ciston, Jim; Pierce, Jordan; Harvey, Tyler R.; Chess, Jordan; McMorran, Benjamin J.; Czarnik, Cory; Rose, Harald H.; Ercius, Peter

    2016-02-29

    The ability to image light elements in soft matter at atomic resolution enables unprecedented insight into the structure and properties of molecular heterostructures and beam-sensitive nanomaterials. In this study, we introduce a scanning transmission electron microscopy technique combining a pre-specimen phase plate designed to produce a probe with structured phase with a high-speed direct electron detector to generate nearly linear contrast images with high efficiency. We demonstrate this method by using both experiment and simulation to simultaneously image the atomic-scale structure of weakly scattering amorphous carbon and strongly scattering gold nanoparticles. Our method demonstrates strong contrast for both materials, makingmore » it a promising candidate for structural determination of heterogeneous soft/hard matter samples even at low electron doses comparable to traditional phase-contrast transmission electron microscopy. Ultimately, simulated images demonstrate the extension of this technique to the challenging problem of structural determination of biological material at the surface of inorganic crystals.« less

  8. Thermal expansion recovery microscopy: Practical design considerations

    SciTech Connect (OSTI)

    Mingolo, N. Martnez, O. E.

    2014-01-15

    A detailed study of relevant parameters for the design and operation of a photothermal microscope technique recently introduced is presented. The technique, named thermal expansion recovery microscopy (ThERM) relies in the measurement of the defocusing introduced by a surface that expands and recovers upon the heating from a modulated source. A new two lens design is presented that can be easily adapted to commercial infinite conjugate microscopes and the sensitivity to misalignment is analyzed. The way to determine the beam size by means of a focus scan and the use of that same scan to verify if a thermoreflectance signal is overlapping with the desired ThERM mechanism are discussed. Finally, a method to cancel the thermoreflectance signal by an adequate choice of a nanometric coating is presented.

  9. Atomizing, continuous, water monitoring module

    DOE Patents [OSTI]

    Thompson, C.V.; Wise, M.B.

    1997-07-08

    A system for continuously analyzing volatile constituents of a liquid is described. The system contains a pump for continuously pumping the liquid to be tested at a predetermined flow rate into an extracting container through a liquid directing tube having an orifice at one end and positioned to direct the liquid into the extracting container at a flow rate sufficient to atomize the liquid within the extracting container. A continuous supply of helium carrier gas at a predetermined flow rate is directed through a tube into the extracting container and co-mingled with the atomized liquid to extract the volatile constituents contained within the atomized liquid. The helium containing the extracted volatile constituents flows out of the extracting container into a mass spectrometer for an analysis of the volatile constituents of the liquid. 3 figs.

  10. Atomizing, continuous, water monitoring module

    DOE Patents [OSTI]

    Thompson, Cyril V.; Wise, Marcus B.

    1997-01-01

    A system for continuously analyzing volatile constituents of a liquid is described. The system contains a pump for continuously pumping the liquid to be tested at a predetermined flow rate into an extracting container through a liquid directing tube having an orifice at one end and positioned to direct the liquid into the extracting container at a flow rate sufficient to atomize the liquid within the extracting container. A continuous supply of helium carrier gas at a predetermined flow rate is directed through a tube into the extracting container and co-mingled with the atomized liquid to extract the volatile constituents contained within the atomized liquid. The helium containing the extracted volatile constituents flows out of the extracting container into a mass spectrometer for an analysis of the volatile constituents of the liquid.

  11. Hot atom chemistry and radiopharmaceuticals

    SciTech Connect (OSTI)

    Krohn, Kenneth A.; Moerlein, Stephen M.; Link, Jeanne M.; Welch, Michael J.

    2012-12-19

    The chemical products made in a cyclotron target are a combined result of the chemical effects of the nuclear transformation that made the radioactive atom and the bulk radiolysis in the target. This review uses some well-known examples to understand how hot atom chemistry explains the primary products from a nuclear reaction and then how radiation chemistry is exploited to set up the optimal product for radiosynthesis. It also addresses the chemical effects of nuclear decay. There are important principles that are common to hot atom chemistry and radiopharmaceutical chemistry. Both emphasize short-lived radionuclides and manipulation of high specific activity nuclides. Furthermore, they both rely on radiochromatographic separation for identification of no-carrieradded products.

  12. Atomic hydrogen in planetary nebulae

    SciTech Connect (OSTI)

    Schneider, S.E.; Silverglate, P.R.; Altschuler, D.R.; Giovanardi, C.

    1987-03-01

    The authors searched for neutral atomic hydrogen associated with 22 planetary nebulae and three evolved stars in the 21 cm line at the Arecibo Observatory. Objects whose radial velocities permitted discrimination from Galactic H I were chosen for observation. Hydrogen was detected in absorption from IC 4997. From the measurements new low limits are derived to the mass of atomic hydrogen associated with the undetected nebulae. Radio continuum observations were also made of several of the nebulae at 12.6 cm. The authors reexamine previous measurements of H I in planetary nebulae, and present the data on a consistent footing. The question of planetary nebula distances is considered at length. Finally, implications of the H I measurements for nebular evolution are discussed and it is suggested that atomic hydrogen seen in absorption was expelled from the progenitor star during the final 1000 yr prior to the onset of ionization. 68 references.

  13. Verification of maximum impact force for interim storage cask for the Fast Flux Testing Facility

    SciTech Connect (OSTI)

    Chen, W.W.; Chang, S.J.

    1996-06-01

    The objective of this paper is to perform an impact analysis of the Interim Storage Cask (ISC) of the Fast Flux Test Facility (FFTF) for a 4-ft end drop. The ISC is a concrete cask used to store spent nuclear fuels. The analysis is to justify the impact force calculated by General Atomics (General Atomics, 1994) using the ILMOD computer code. ILMOD determines the maximum force developed by the concrete crushing which occurs when the drop energy has been absorbed. The maximum force, multiplied by the dynamic load factor (DLF), was used to determine the maximum g-level on the cask during a 4-ft end drop accident onto the heavily reinforced FFTF Reactor Service Building`s concrete surface. For the analysis, this surface was assumed to be unyielding and the cask absorbed all the drop energy. This conservative assumption simplified the modeling used to qualify the cask`s structural integrity for this accident condition.

  14. Robust quantum logic in neutral atoms via adiabatic Rydberg dressing

    SciTech Connect (OSTI)

    Keating, Tyler; Cook, Robert L.; Hankin, Aaron M.; Jau, Yuan -Yu; Biedermann, Grant W.; Deutsch, Ivan H.

    2015-01-28

    We study a scheme for implementing a controlled-Z (CZ) gate between two neutral-atom qubits based on the Rydberg blockade mechanism in a manner that is robust to errors caused by atomic motion. By employing adiabatic dressing of the ground electronic state, we can protect the gate from decoherence due to random phase errors that typically arise because of atomic thermal motion. In addition, the adiabatic protocol allows for a Doppler-free configuration that involves counterpropagating lasers in a ?+/?- orthogonal polarization geometry that further reduces motional errors due to Doppler shifts. The residual motional error is dominated by dipole-dipole forces acting on doubly-excited Rydberg atoms when the blockade is imperfect. As a result, for reasonable parameters, with qubits encoded into the clock states of 133Cs, we predict that our protocol could produce a CZ gate in < 10 ?s with error probability on the order of 10-3.

  15. Robust quantum logic in neutral atoms via adiabatic Rydberg dressing

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Keating, Tyler; Cook, Robert L.; Hankin, Aaron M.; Jau, Yuan -Yu; Biedermann, Grant W.; Deutsch, Ivan H.

    2015-01-28

    We study a scheme for implementing a controlled-Z (CZ) gate between two neutral-atom qubits based on the Rydberg blockade mechanism in a manner that is robust to errors caused by atomic motion. By employing adiabatic dressing of the ground electronic state, we can protect the gate from decoherence due to random phase errors that typically arise because of atomic thermal motion. In addition, the adiabatic protocol allows for a Doppler-free configuration that involves counterpropagating lasers in a σ+/σ- orthogonal polarization geometry that further reduces motional errors due to Doppler shifts. The residual motional error is dominated by dipole-dipole forces actingmore » on doubly-excited Rydberg atoms when the blockade is imperfect. As a result, for reasonable parameters, with qubits encoded into the clock states of 133Cs, we predict that our protocol could produce a CZ gate in < 10 μs with error probability on the order of 10-3.« less

  16. Casimir force in absorbing multilayers

    SciTech Connect (OSTI)

    Tomas, M.S.

    2002-11-01

    The Casimir effect in a dispersive and absorbing multilayered system is considered adopting the (net) vacuum-field pressure point of view to the Casimir force. Using the properties of the macroscopic field operators appropriate for absorbing systems and a convenient compact form of the Green function for a multilayer, a straightforward and transparent derivation of the Casimir force in a lossless layer of an otherwise absorbing multilayer is presented. The resulting expression, in terms of the reflection coefficients of the surrounding stacks of layers, is of the same form as that obtained by Zhou and Spruch for a purely dispersive multilayer using the (surface) mode summation method [Phys. Rev. A 52, 297 (1995)]. Owing to the recursion relations that the generalized Fresnel coefficients satisfy, this result can be applied to more complex systems with planar symmetry. This is illustrated by calculating the Casimir force on a dielectric (metallic) slab in a planar cavity with realistic mirrors. Also, a relationship between the Casimir force and energy in two different layers is established.

  17. On the calculation of internal forces in mechanically stressed polyatomic molecules

    SciTech Connect (OSTI)

    Avdoshenko, Stanislav M.; Konda, Sai Sriharsha M.; Makarov, Dmitrii E.

    2014-10-07

    We discuss how to define and to compute internal forces in a molecule subjected to mechanical stress. Because of the inherently many-body character of intramolecular interactions, internal forces cannot be uniquely defined without specifying a set of internal coordinates used to describe the molecular structure. When such a set is comprised of 3N − 6 interactomic distances (N being the number of atoms) and includes the bond lengths of interest, we show that the associated forces, while satisfying the equation F = ∂V/∂R (where R is the bond length, F is the internal force in this bond, and V is the potential energy of the molecule), can be determined from the molecular geometry alone. We illustrate these ideas using several toy models ranging from small molecules to a graphene sheet and show that the magnitude of the internal force in a bond is not necessarily a good predictor of its strength in response to mechanical loading. At the same time, analysis of internal forces reveals interesting phenomena such as the force multiplication effect, where weak external forces may, e.g., be used to break strong bonds, and offers insight into the catch-bond phenomenon where chemical reactivity is suppressed through application of a force.

  18. High pressure injection and atomization characteristics of methanol

    SciTech Connect (OSTI)

    Aigal, A.K.; Pundir, B.P.; Khatchian, A.S.

    1986-01-01

    Research on conversion of diesel engines for operation on methanol is, currently, of worldwide interest. Due to requirements of higher cyclic delivery of methanol and changes in fuel properties e.g. compressibility, wave propagation velocity, viscosity, surface tension, density etc., injection and atomization characteristics of methanol are expected to be different from diesel. From the equation of continuity and forces acting on the injection system elements and applying the principles of similarity, modifications required in the injection system were identified. Methanol injection and atomization characteristics were studied with a modified injection system and compared with those observed with diesel fuel. Methanol gave more favourable cyclic delivery characteristics than diesel. Laser diffraction technique was used to study time and space resolved drop size distribution in methanol and diesel sprays. With methanol, drop size distribution were, generally, much narrower and droplets were smaller than diesel. Spatial distribution of drop size in methanol spray showed somewhat different trends than for diesel.

  19. Relativistic atomic beam spectroscopy II

    SciTech Connect (OSTI)

    1989-12-31

    The negative ion of H is one of the simplest 3-body atomic systems. The techniques we have developed for experimental study of atoms moving near speed of light have been productive. This proposal request continuing support for experimental studies of the H{sup -} system, principally at the 800 MeV linear accelerator (LAMPF) at Los Alamos. Four experiments are currently planned: photodetachment of H{sup -} near threshold in electric field, interaction of relativistic H{sup -} ions with matter, high excitations and double charge escape in H{sup -}, and multiphoton detachment of electrons from H{sup -}.

  20. Fuel oil quality task force

    SciTech Connect (OSTI)

    Laisy, J.; Turk, V.

    1997-09-01

    In April, 1996, the R.W. Beckett Corporation became aware of a series of apparently unrelated symptoms that made the leadership of the company concerned that there could be a fuel oil quality problem. A task force of company employees and industry consultants was convened to address the topic of current No. 2 heating oil quality and its effect on burner performance. The task force studied changes in fuel oil specifications and trends in properties that have occurred over the past few years. Experiments were performed at Beckett and Brookhaven National Laboratory to understand the effect of changes in some fuel oil properties. Studies by other groups were reviewed, and field installations were inspected to gain information about the performance of fuel oil that is currently being used in the U.S. and Canada. There was a special concern about the use of red dye in heating oils and the impact of sulfur levels due to the October, 1993 requirement of low sulfur (<0.05%) for on-highway diesel fuel. The results of the task force`s efforts were published in July, 1996. The primary conclusion of the task force was that there is not a crisis or widespread general problem with fuel oil quality. Localized problems that were seen may have been related to refinery practices and/or non-traditional fuel sources. System cleanliness is very important and the cause of many oil burner system problems. Finally, heating oil quality should get ongoing careful attention by Beckett engineering personnel and heating oil industry groups.

  1. Solvent-induced forces in protein folding

    SciTech Connect (OSTI)

    Ben-Naim, A. (Hebrew Univ., Jerusalem (Israel))

    1990-08-23

    The solvent-induced forces between various groups on the protein are examined. It is found that the intramolecular hydrophilic forces are likely to be the strongest forces mediated through the solvent. It is argued that these are probably the most important solvent-induced driving forces in the process of protein folding.

  2. October 9, 2014- SEAB Task Force Meeting

    Broader source: Energy.gov [DOE]

    SECRETARY OF ENERGY ADVISORY BOARDTask Force Meeting on Technology Development for Environmental Management (EM)

  3. BEAM TRANSPORT AND STORAGE WITH COLD NEUTRAL ATOMS AND MOLECULES

    SciTech Connect (OSTI)

    Walstrom, Peter L.

    2012-05-15

    A large class of cold neutral atoms and molecules is subject to magnetic field-gradient forces. In the presence of a field, hyperfine atomic states are split into several Zeeman levels. The slopes of these curves vs. field are the effective magnetic moments. By means of optical pumping in a field, Zeeman states of neutral lithium atoms and CaH molecules with effective magnetic moments of nearly {+-} one Bohr magneton can be selected. Particles in Zeeman states for which the energy increases with field are repelled by increasing fields; particles in states for which the energy decreases with field are attracted to increasing fields. For stable magnetic confinement, field-repelled states are required. Neutral-particle velocities in the present study are on the order of tens to hundreds of m/s and the magnetic fields needed for transport and injection are on the order of in the range of 0.01-1T. Many of the general concepts of charged-particle beam transport carry over into neutral particle spin-force optics, but with important differences. In general, the role of bending dipoles in charged particle optics is played by quadrupoles in neutral particle optics; the role of quadrupoles is played by sextupoles. The neutralparticle analog of charge-exchange injection into storage rings is the use of lasers to flip the state of particles from field-seeking to field-repelled. Preliminary tracking results for two neutral atom/molecule storage ring configurations are presented. It was found that orbit instabilities limit the confinment time in a racetrack-shaped ring with discrete magnetic elements with drift spaces between them; stable behavior was observed in a toroidal ring with a continuous sextupole field. An alternative concept using a linear sextupole or octupole channel with solenoids on the ends is presently being considered.

  4. Ion-induced electron emission microscopy

    DOE Patents [OSTI]

    Doyle, Barney L.; Vizkelethy, Gyorgy; Weller, Robert A.

    2001-01-01

    An ion beam analysis system that creates multidimensional maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the secondary electrons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted secondary electrons are collected in a strong electric field perpendicular to the sample surface and (optionally) projected and refocused by the electron lenses found in a photon emission electron microscope, amplified by microchannel plates and then their exact position is sensed by a very sensitive X Y position detector. Position signals from this secondary electron detector are then correlated in time with nuclear, atomic or electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these secondary electrons in the fit place.

  5. Atomically-resolved mapping of polarization and electric fields across ferroelectric-oxide interfaces by Z-contrast imaging

    SciTech Connect (OSTI)

    Chang, Hye Jung; Kalinin, Sergei; Morozovska, A. N.; Huijben, Mark; Chu, Ying-Hao; Yu, P; Ramesh, R.; Eliseev, E. A.; Svechnikov, S. V.; Pennycook, Stephen J; Borisevich, Albina Y

    2011-01-01

    Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a-STEM image, b-corresponding displacement profile) is combined with Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.

  6. Copper intercalation at the interface of graphene and Ir(111) studied by scanning tunneling microscopy

    SciTech Connect (OSTI)

    Sicot, M. Fagot-Revurat, Y.; Kierren, B.; Vasseur, G.; Malterre, D.

    2014-11-10

    We report on the intercalation of a submonolayer of copper at 775?K underneath graphene epitaxially grown on Ir(111) studied by means of low energy electron diffraction (LEED) and scanning tunneling microscopy (STM) at 77?K. Nucleation and growth dynamics of Cu below graphene have been investigated, and, most importantly, the intercalation mechanism has been identified. First, LEED patterns reveal the pseudomorphic growth of Cu on Ir under the topmost graphene layer resulting in a large Cu in-plane lattice parameter expansion of about 6% compared to Cu(111). Second, large-scale STM topographs as a function of Cu coverage show that Cu diffusion on Ir below graphene exhibits a low energy barrier resulting in Cu accumulation at Ir step edges. As a result, the graphene sheet undergoes a strong edges reshaping. Finally, atomically-resolved STM images reveal a damaged graphene sheet at the atomic scale after metal intercalation. Point defects in graphene were shown to be carbon vacancies. According to these results, a Cu penetration path beneath graphene is proposed to occur via metal aided defect formation with no or poor self healing of the graphene sheet. This work illustrates the fact that Cu intercalation is harmful for graphene grown on Ir(111) at the atomic scale.

  7. Complete information acquisition in scanning probe microscopy

    SciTech Connect (OSTI)

    Belianinov, Alex; Kalinin, Sergei V; Jesse, Stephen

    2015-01-01

    In the last three decades, scanning probe microscopy (SPM) has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of the SPM measurements is the information transfer from the tip-surface junction to a macroscopic measurement system. This process reduces the many degrees of freedom of a vibrating cantilever to relatively few parameters recorded as images. Similarly, the details of dynamic cantilever response at sub-microsecond time scales of transients, higher-order eigenmodes and harmonics are averaged out by transitioning to millisecond time scale of pixel acquisition. Hence, the amount of information available to the external observer is severely limited, and its selection is biased by the chosen data processing method. Here, we report a fundamentally new approach for SPM imaging based on information theory-type analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material s properties and their mutual interactions, and SPM imaging at the information channel capacity limit.

  8. Complete information acquisition in scanning probe microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Belianinov, Alex; Kalinin, Sergei V.; Jesse, Stephen

    2015-03-13

    In the last three decades, scanning probe microscopy (SPM) has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of the SPM measurements is the information transfer from the tip-surface junction to a macroscopic measurement system. This process reduces the many degrees of freedom of a vibrating cantilever to relatively few parameters recorded as images. Similarly, the details of dynamic cantilever response at sub-microsecond time scales of transients, higher-order eigenmodes and harmonics are averaged out by transitioning to millisecond time scale of pixel acquisition. Hence, the amount of information available to the external observer ismore » severely limited, and its selection is biased by the chosen data processing method. Here, we report a fundamentally new approach for SPM imaging based on information theory-type analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material s properties and their mutual interactions, and SPM imaging at the information channel capacity limit.« less

  9. X-ray optics for scanning fluorescence microscopy and other applications

    SciTech Connect (OSTI)

    Ryon, R.W.; Warburton, W.K.

    1992-05-01

    Scanning x-ray fluorescence microscopy is analogous to scanning electron microscopy. Maps of chemical element distribution are produced by scanning with a very small x-ray beam. Goal is to perform such scanning microscopy with resolution in the range of <1 to 10 {mu}m, using standard laboratory x-ray tubes. We are investigating mirror optics in the Kirkpatrick-Baez (K-B) configuration. K-B optics uses two curved mirrors mounted orthogonally along the optical axis. The first mirror provides vertical focus, the second mirror provides horizontal focus. We have used two types of mirrors: synthetic multilayers and crystals. Multilayer mirrors are used with lower energy radiation such as Cu K{alpha}. At higher energies such as Ag K{alpha}, silicon wafers are used in order to increase the incidence angles and thereby the photon collection efficiency. In order to increase the surface area of multilayers which reflects x-rays at the Bragg angle, we have designed mirrors with the spacing between layers graded along the optic axis in order to compensate for the changing angle of incidence. Likewise, to achieve a large reflecting surface with silicon, the wafers are placed on a specially designed lever arm which is bent into a log spiral by applying force at one end. In this way, the same diffracting angle is maintained over the entire surface of the wafer, providing a large solid angle for photon collection.

  10. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Record-Setting Microscopy Illuminates Energy Storage Materials Print Thursday, 22 January 2015 12:10 X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics.

  11. Stimulation Emission Depletion (STED) microscopy | The Ames Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Stimulation Emission Depletion (STED) microscopy What is STED? Stimulation Emission Depletion (STED) microscopy is a super resolution microscopy tool that captures super resolution images on a nanometer scale. A donut-shaped red light switches off surrounding molecules, allowing only those in the center to fluoresce. At the nanoscale, light microscopes cannot tell features apart. Because light moves as waves and the particles of light are so close together, the lens used cannot focus all of the

  12. Displacement per Atom, Primary Knocked-on Atoms Produced in an Atomic Solid Target

    Energy Science and Technology Software Center (OSTI)

    2015-07-01

    Version 00 DART calculates the total number of displacements, primary knocked-on atoms, recoil spectra, displacement cross sections and displacement per atoms rates in a poly atomic solid target, composed of many different isotopes, using ENDF/B-VI derived cross sections. To calculate these values, different incident particles were considered: neutrons, ions and electrons. The user needs only to specify an incident particle energy spectrum and the composition of the target. The number of displaced atoms is calculatedmore » within the Binary Collision Approximation framework. To calculate the number of displacements the DART code does not use the classical NRT dpa analytical formula, which is only appropriate for projectile and target of the same mass. It numerically solves the linearized Boltzmann equation for a polyatomic target. It can be a useful tool to select the nature and energy of ions or electrons in particle accelerators or electron microscopes to mimic the primary damage induced by neutron irradiation in nuclear plants or fission facilities. Nuclear data: • Typically any ENDFB format evaluation may be used. This package includes the ENDFB-VI nuclear data library. Energy ranges: • Neutron or ion : 10E-11 to 20 MeV Data library distributed with DART v1.0: • ENDFB-VI nuclear data library« less

  13. Optoacoustic Microscopy for Investigation of MaterialNanostructures...

    Office of Scientific and Technical Information (OSTI)

    be used for quantitative imaging of nanoscale material features - including features that may be buried so as to be inaccessible to conventional lightwave or electron microscopies. ...

  14. A Sealed Liquid Cell for In Situ Transmission Electron Microscopy...

    Office of Scientific and Technical Information (OSTI)

    A Sealed Liquid Cell for In Situ Transmission Electron Microscopy of Controlled Electrochemical Processes Citation Details In-Document Search Title: A Sealed Liquid Cell for In ...

  15. Simultaneous cryo X-ray ptychographic and fluorescence microscopy...

    Office of Scientific and Technical Information (OSTI)

    ptychographic and fluorescence microscopy of green algae You are accessing a document from the Department of Energy's (DOE) Public Access Gateway for Energy & Science (PAGES). ...

  16. Modulated microwave microscopy and probes used therewith (Patent...

    Office of Scientific and Technical Information (OSTI)

    Citation Details In-Document Search Title: Modulated microwave microscopy and probes used therewith A microwave microscope including a probe tip electrode vertically positionable ...

  17. Simultaneous cryo X-ray ptychographic and fluorescence microscopy...

    Office of Scientific and Technical Information (OSTI)

    Accepted Manuscript: Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae Prev Next Title: Simultaneous cryo X-ray ptychographic and fluorescence ...

  18. X-Ray Microscopy Reveals How Crystal Mechanics Drive Battery...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Microscopy Reveals How Crystal Mechanics Drive Battery Performance Print ... are one of the best performing battery electrode materials, able to repeatedly ...

  19. Simultaneous cryo X-ray ptychographic and fluorescence microscopy...

    Office of Scientific and Technical Information (OSTI)

    and fluorescence microscopy of green algae Citation Details In-Document Search ... Visit OSTI to utilize additional information resources in energy science and technology. A ...

  20. NEAR-IR TWO PHOTON MICROSCOPY IMAGING OF SILICA NANOPARTICLES...

    Office of Scientific and Technical Information (OSTI)

    NANOPARTICLES FUNCTIONALIZED WITH ISOLATED SENSITIZED Yb(III) CENTERS Citation Details In-Document Search Title: NEAR-IR TWO PHOTON MICROSCOPY IMAGING OF SILICA NANOPARTICLES ...

  1. In situ transmission electron microscopy investigation of the...

    Office of Scientific and Technical Information (OSTI)

    In situ transmission electron microscopy investigation of the interfacial reaction between Ni and Al during rapid heating in a nanocalorimeter Grapes, Michael D. Department of...

  2. In situ transmission electron microscopy investigation of the...

    Office of Scientific and Technical Information (OSTI)

    Published Article: In situ transmission electron microscopy investigation of the interfacial reaction between Ni and Al during rapid heating in a nanocalorimeter Title: In situ...

  3. "A Novel Objective for EUV Microscopy and EUV Lithography" Inventors...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Novel Objective for EUV Microscopy and EUV Lithography" Inventors ..--.. Manfred Bitter, Kenneth Hill, Philip Efthimion. This invention is a new x-ray scheme for stigmatic...

  4. X-Ray Diffraction Microscopy of Magnetic Structures (Journal...

    Office of Scientific and Technical Information (OSTI)

    Prev Next Title: X-Ray Diffraction Microscopy of Magnetic Structures Authors: Turner, Joshua J. ; Huang, Xiaojing ; Krupin, Oleg ; Seu, Keoki A. ; Parks, Daniel ; Kevan,...

  5. Atomic-Resolution Spectroscopic Imaging and In Situ Environmental Study of

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Bimetallic Nanocatalysts by Fast Electrons | Stanford Synchrotron Radiation Lightsource Atomic-Resolution Spectroscopic Imaging and In Situ Environmental Study of Bimetallic Nanocatalysts by Fast Electrons Thursday, October 24, 2013 - 3:30pm SLAC, Conference Room 137-322 Presented by Huolin Xin Center for Functional Nanomaterials Brookhaven National Laboratory, Upton, New York Scanning transmission electron microscopy (STEM) in combination with electron energy loss spectroscopy (EELS) has

  6. Hickam Air Force Base | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Technology Validation » Hickam Air Force Base Hickam Air Force Base Photo of hybrid fuel cell bus at Hickam Air Force Base Hickam Air Force Base spans 2,850 acres in Honolulu, Hawaii. The military base is home to the 15th Airlift Wing, the Hawaii Air National Guard, and the Pacific Air Forces headquarters. With support from the Hawaii Center for Advanced Transportation Technologies and the Air Force Advanced Power Technology Office, Hickam added a fuel cell hybrid electric bus to its fleet in

  7. Impact of Short-Range Forces on Defect Production from High-Energy Collisions

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Stoller, R. E.; Tamm, A.; Béland, L. K.; Samolyuk, G. D.; Stocks, G. M.; Caro, A.; Slipchenko, L. V.; Osetsky, Yu. N.; Aabloo, A.; Klintenberg, M.; et al

    2016-04-25

    Primary radiation damage formation in solid materials typically involves collisions between atoms that have up to a few hundred keV of kinetic energy. The distance between two colliding atoms can approach 0.05 nm during these collisions. At such small atomic separations, force fields fitted to equilibrium properties tend to significantly underestimate the potential energy of the colliding dimer. To enable molecular dynamics simulations of high-energy collisions, it is common practice to use a screened Coulomb force field to describe the interactions and to smoothly join this to the equilibrium force field at a suitable interatomic spacing. But, there is nomore » accepted standard method for choosing the parameters used in the joining process, and our results prove that defect production is sensitive to how the force fields are linked. A new procedure is presented that involves the use of ab initio calculations to determine the magnitude and spatial dependence of the pair interactions at intermediate distances, along with systematic criteria for choosing the joining parameters. Results are presented for the case of nickel, which demonstrate the use and validity of the procedure.« less

  8. Atomic vapor laser isotope separation

    SciTech Connect (OSTI)

    Stern, R.C.; Paisner, J.A.

    1985-11-08

    Atomic vapor laser isotope separation (AVLIS) is a general and powerful technique. A major present application to the enrichment of uranium for light-water power reactor fuel has been under development for over 10 years. In June 1985 the Department of Energy announced the selection of AVLIS as the technology to meet the nation's future need for the internationally competitive production of uranium separative work. The economic basis for this decision is considered, with an indicated of the constraints placed on the process figures of merit and the process laser system. We then trace an atom through a generic AVLIS separator and give examples of the physical steps encountered, the models used to describe the process physics, the fundamental parameters involved, and the role of diagnostic laser measurements.

  9. The Modified Embedded Atom Method

    SciTech Connect (OSTI)

    Baskes, M.I.

    1994-08-01

    Recent modifications have been made to generalize the Embedded Atom Method (EAM) to describe bonding in diverse materials. By including angular dependence of the electron density in an empirical way, the Modified Embedded Atom Method (MEAM) has been able to reproduce the basic energetic and structural properties of 45 elements. This method is ideally suited for examining the interfacial behavior of dissimilar materials. This paper explains in detail the derivation of the method, shows how the parameters of the MEAM are determined directly from experiment or first principles calculations, and examines the quality of the reproduction of the database. Materials with fcc, bcc, hcp, and diamond cubic crystal structure are discussed. A few simple examples of the application of the MEAM to surfaces and interfaces are presented. Calculations of pullout of a SiC fiber in a diamond matrix as a function of applied stress show non-uniform deformation of the fiber.

  10. Casimir-Polder interaction between an atom and an infinite boundary in a thermal bath

    SciTech Connect (OSTI)

    She Wuying; Yu Hongwei; Zhu Zhiying

    2010-01-15

    We study the energy level shift of a static two-level atom interacting with a massless scalar field in a thermal bath with the presence of a plane boundary, which gives rise to the Casimir-Polder force. We separately calculate contributions of both thermal fluctuations and radiation reaction using the formalism suggested by J. Dalibard, J. Dupont-Roc, and C. Cohen-Tannoudji [J. Phys. (France) 43, 1617 (1982); 45, 673 (1984)] and analyze in detail the behaviors of the total energy level shifts in three distinct distance regimes in both the low- and high-temperature limits. A comparison of our results with those of a uniformly accelerated atom reveals that uniformly accelerated atoms, in general, do not behave the same as static ones in a thermal bath at the Unruh temperature in terms of the atomic energy level shifts.

  11. The Future of Atomic Energy

    DOE R&D Accomplishments [OSTI]

    Fermi, E.

    1946-05-27

    There is definitely a technical possibility that atomic power may gradually develop into one of the principal sources of useful power. If this expectation will prove correct, great advantages can be expected to come from the fact that the weight of the fuel is almost negligible. This feature may be particularly valuable for making power available to regions of difficult access and far from deposits of coal. It also may prove a great asset in mobile power units for example in a power plant for ship propulsion. On the negative side there are some technical limitations to be applicability of atomic power of which perhaps the most serious is the impossibility of constructing light power units; also there will be some peculiar difficulties in operating atomic plants, as for example the necessity of handling highly radioactive substances which will necessitate, at least for some considerable period, the use of specially skilled personnel for the operation. But the chief obstacle in the way of developing atomic power will be the difficulty of organizing a large scale industrial development in an internationally safe way. This presents actually problems much more difficult to solve than any of the technical developments that are necessary, It will require an unusual amount of statesmanship to balance properly the necessity of allaying the international suspicion that arises from withholding technical secrets against the obvious danger of dumping the details of the procedures for an extremely dangerous new method of warfare on a world that may not yet be prepared to renounce war. Furthermore, the proper balance should be found in the relatively short time that will elapse before the 'secrets' will naturally become open knowledge by rediscovery on part of the scientists and engineers of other countries.

  12. Direct imaging of crystal structure and defects in metastable Ge{sub 2}Sb{sub 2}Te{sub 5} by quantitative aberration-corrected scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Ross, Ulrich; Lotnyk, Andriy Thelander, Erik; Rauschenbach, Bernd

    2014-03-24

    Knowledge about the atomic structure and vacancy distribution in phase change materials is of foremost importance in order to understand the underlying mechanism of fast reversible phase transformation. In this Letter, by combining state-of-the-art aberration-corrected scanning transmission electron microscopy with image simulations, we are able to map the local atomic structure and composition of a textured metastable Ge{sub 2}Sb{sub 2}Te{sub 5} thin film deposited by pulsed laser deposition with excellent spatial resolution. The atomic-resolution scanning transmission electron microscopy investigations display the heterogeneous defect structure of the Ge{sub 2}Sb{sub 2}Te{sub 5} phase. The obtained results are discussed. Highly oriented Ge{sub 2}Sb{sub 2}Te{sub 5} thin films appear to be a promising approach for further atomic-resolution investigations of the phase change behavior of this material class.

  13. Casimir force for absorbing media in an open quantum system framework: Scalar model

    SciTech Connect (OSTI)

    Lombardo, Fernando C.; Rubio Lopez, Adrian E.; Mazzitelli, Francisco D.

    2011-11-15

    In this article we compute the Casimir force between two finite-width mirrors at finite temperature, working in a simplified model in 1+1 dimensions. The mirrors, considered as dissipative media, are modeled by a continuous set of harmonic oscillators which in turn are coupled to an external environment at thermal equilibrium. The calculation of the Casimir force is performed in the framework of the theory of open quantum systems. It is shown that the Casimir interaction has two different contributions: the usual radiation pressure from the vacuum, which is obtained for ideal mirrors without dissipation or losses, and a Langevin force associated with the noise induced by the interaction between dielectric atoms in the slabs and the thermal bath. Both contributions to the Casimir force are needed in order to reproduce the analogous Lifshitz formula in 1+1 dimensions. We also discuss the relationship between the electromagnetic properties of the mirrors and the spectral density of the environment.

  14. Work function variation of MoS{sub 2} atomic layers grown with chemical vapor deposition: The effects of thickness and the adsorption of water/oxygen molecules

    SciTech Connect (OSTI)

    Kim, Jong Hun; Kim, Jae Hyeon; Park, Jeong Young E-mail: jeongypark@kaist.ac.kr; Lee, Jinhwan; Hwang, C. C.; Lee, Changgu E-mail: jeongypark@kaist.ac.kr

    2015-06-22

    The electrical properties of two-dimensional atomic sheets exhibit remarkable dependences on layer thickness and surface chemistry. Here, we investigated the variation of the work function properties of MoS{sub 2} films prepared with chemical vapor deposition (CVD) on SiO{sub 2} substrates with the number of film layers. Wafer-scale CVD MoS{sub 2} films with 2, 4, and 12 layers were fabricated on SiO{sub 2}, and their properties were evaluated by using Raman and photoluminescence spectroscopies. In accordance with our X-ray photoelectron spectroscopy results, our Kelvin probe force microscopy investigation found that the surface potential of the MoS{sub 2} films increases by ∼0.15 eV when the number of layers is increased from 2 to 12. Photoemission spectroscopy (PES) with in-situ annealing under ultra high vacuum conditions was used to directly demonstrate that this work function shift is associated with the screening effects of oxygen or water molecules adsorbed on the film surface. After annealing, it was found with PES that the surface potential decreases by ∼0.2 eV upon the removal of the adsorbed layers, which confirms that adsorbed species have a role in the variation in the work function.

  15. Atomic vapor laser isotope separation process

    DOE Patents [OSTI]

    Wyeth, R.W.; Paisner, J.A.; Story, T.

    1990-08-21

    A laser spectroscopy system is utilized in an atomic vapor laser isotope separation process. The system determines spectral components of an atomic vapor utilizing a laser heterodyne technique. 23 figs.

  16. Princeton Plasma Physics Lab - General Atomics (GA)

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    general-atomics-ga General Atomics en The Scorpion's Strategy: "Catch and Subdue" http:www.pppl.govnode1132

  17. SAVANNAH RIVER SITE FORCE REPORT

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    FORCE REPORT 3rd Quarter - FY 2016 Data Date:June 30, 2016 Feds/ Prime Contract 1st Tier Teaming Subs Staff Aug / Support Service Craft / Union Hall / Trades Part Time / Limited Service Site TOTAL Federal Organizations DOE-SR 269 7 62 - - 338 DOE-OIG-SR 15 1 - - - 16 NNSA-SRFO 24 1 - 25 NNSA APM 20 2 12 - - 34 NNSA NA-23 10 - 3 - - 13 EM Only Total 269 8 62 - - 339 NNSA Only Total 54 2 16 - - 72 Other Funding Total 15 - - - - 15 Federal Total 338 10 78 - - 426 SRS Contracts SRNS 4,644 - 359 317

  18. ARMY SERiWE FORCES

    Office of Legacy Management (LM)

    ' This doc~omnt consists tif-..$---..-- PaWs ?5-i3s4 " No.,J ______ d&---.copies. series.-f;;i, ' ARMY SERiWE FORCES UNITED STATES ' ENGINEER OFFICE MANHP.~AN Dwmtcr CHIWOO A\RU o,,,c* P. 0. 90x 3140 A CHICA so, ILrlNole 20 June 1945 F' '2 0 Subject: Licenae Agreement - International Pulverizing Corporation - Subcoritract #7401-37-82. To: The District~Eqinssr, U. S. Engineer Office, Manhattan District, Oak Ridge, Tennessee. Attention: Contract Section. As llsted'below, there are

  19. Link Force Holdings Ltd | Open Energy Information

    Open Energy Info (EERE)

    search Name: Link Force Holdings Ltd Place: China Product: China-based energy saving LED street light maker. References: Link Force Holdings Ltd1 This article is a stub. You...

  20. US Wind Force LLC | Open Energy Information

    Open Energy Info (EERE)

    Jump to: navigation, search Name: US Wind Force LLC Place: Wexford, Pennsylvania Zip: PA 15090-9 Sector: Wind energy Product: US Wind Force, LLC is an independent, privately...

  1. ESPC Success Story - Dyess Air Force Base

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    DYESS AIR FORCE BASE DYESS, TEXAS Water Conservation and Green Energy ESPC SUCCESS STORY Dyess Air Force Base and surrounding west Texas has been under extreme-drought water ...

  2. The Atomic Energy Commission By Alice Buck

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Atomic Energy Commission By Alice Buck July 1983 U.S. Department of Energy Office of Management Office of the Executive Secretariat Office of History and Heritage Resources 1 Introduction Almost a year after World War II ended, Congress established the United States Atomic Energy Commission to foster and control the peacetime development of atomic science and technology. Reflecting America's postwar optimism, Congress declared that atomic energy should be employed not only in the Nation's

  3. How Atomic Vibrations Transform Vanadium Dioxide

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    How Atomic Vibrations Transform Vanadium Dioxide How Atomic Vibrations Transform Vanadium Dioxide Calculations Confirm Material's Potential for Next-Generation Electronics, Energy November 10, 2014 Contact: Dawn Levy, levyd@ornl.gov, 865.576.6448 Budaivibe Vanadium atoms (blue) have unusually large thermal vibrations that stabilize the metallic state of a vanadium dioxide crystal. Red depicts oxygen atoms. Image credit: Oak Ridge National Laboratory For more than 50 years, scientists have

  4. U.S. Air Force (USAF) Air Force Research Laboratory (AFRL)

    Broader source: Energy.gov (indexed) [DOE]

    Benjamin Leever U.S. Air Force (USAF) Air Force Research Laboratory (AFRL) DOE - DoD ... level - Fourth level Fifth level - - - DOD Application Commercial Counterparts Sensor ...

  5. September 2012, Work Force Retention Work Group Status Overview

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Work Force Retention Work Group Status Overview 2 Subgroups: Pro-Force and Non-Pro-Force Pro-Force Subgroup: Accomplishments: 1. Completion of 10 CFR 1046 Protective Force ...

  6. Gauss Sum Factorization with Cold Atoms

    SciTech Connect (OSTI)

    Gilowski, M.; Wendrich, T.; Mueller, T.; Ertmer, W.; Rasel, E. M. [Institut fuer Quantenoptik, Leibniz Universitaet Hannover, Welfengarten 1, D-30167 Hannover (Germany); Jentsch, Ch. [Astrium GmbH-Satellites, 88039 Friedrichshafen (Germany); Schleich, W. P. [Institut fuer Quantenphysik, Universitaet Ulm, Albert-Einstein-Allee 11, D-89081 Ulm (Germany)

    2008-01-25

    We report the first implementation of a Gauss sum factorization algorithm by an internal state Ramsey interferometer using cold atoms. A sequence of appropriately designed light pulses interacts with an ensemble of cold rubidium atoms. The final population in the involved atomic levels determines a Gauss sum. With this technique we factor the number N=263193.

  7. Growth Mode Transition in Complex Oxide Heteroepitaxy: Atomically Resolved Studies

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Tselev, Alexander; Vasudevan, Rama K.; Gianfrancesco, Anthony G.; Qiao, Liang; Meyer, Tricia L.; Lee, Ho Nyung; Biegalski, Michael D.; Baddorf, Arthur P.; Kalinin, Sergei V.

    2016-04-04

    Here we performed investigations of the atomic-scale surface structure of epitaxial La5/8Ca3/8MnO3 thin films as a model system dependent on growth conditions in pulsed laser deposition with emphasis on film growth kinetics. Postdeposition in situ scanning tunneling microscopy was combined with in operando reflective high-energy electron diffraction to monitor the film growth and ex situ X-ray diffraction for structural analysis. We find a correlation between the out-of-plane lattice parameter and both adspecies mobility and height of the Ehrlich–Schwoebel barrier, with mobility of adatoms greater over the cationically stoichiometric terminations. We find that the data suggest that the out-of-plane lattice parametermore » is dependent on the mechanism of epitaxial strain relaxation, which is controlled by the oxidative power of the deposition environment.« less

  8. Atomic Structure of Au329(SR)84 Faradaurate Plasmonic Nanomolecules

    SciTech Connect (OSTI)

    Kumara, Chanaka; Zuo, Xiaobing; Ilavsky, Jan; Cullen, David; Dass, Amala

    2015-04-03

    To design novel nanomaterials, it is important to precisely control the composition, determine the atomic structure, and manipulate the structure to tune the materials property. Here we present a comprehensive characterization of the material whose composition is Au329(SR)84 precisely, therefore referred to as a nanomolecule. The size homogeneity was shown by electron microscopy, solution X-ray scattering, and mass spectrometry. We proposed its atomic structure to contain the Au260 core using experiments and modeling of a total-scattering-based atomic-pair distribution functional analysis. HAADF-STEM images shows fcc-like 2.0 ± 0.1 nm diameter nanomolecules.

  9. Atomic Structure Calculations from the Los Alamos Atomic Physics Codes

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Cowan, R. D.

    The well known Hartree-Fock method of R.D. Cowan, developed at Los Alamos National Laboratory, is used for the atomic structure calculations. Electron impact excitation cross sections are calculated using either the distorted wave approximation (DWA) or the first order many body theory (FOMBT). Electron impact ionization cross sections can be calculated using the scaled hydrogenic method developed by Sampson and co-workers, the binary encounter method or the distorted wave method. Photoionization cross sections and, where appropriate, autoionizations are also calculated. Original manuals for the atomic structure code, the collisional excitation code, and the ionization code, are available from this website. Using the specialized interface, you will be able to define the ionization stage of an element and pick the initial and final configurations. You will be led through a series of web pages ending with a display of results in the form of cross sections, collision strengths or rates coefficients. Results are available in tabular and graphic form.

  10. High-resolution ab initio three-dimensional x-ray diffraction microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Chapman, Henry N.; Barty, Anton; Marchesini, Stefano; Noy, Aleksandr; Hau-Riege, Stefan P.; Cui, Congwu; Howells, Malcolm R.; Rosen, Rachel; He, Haifeng; Spence, John C. H.; et al

    2006-01-01

    Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatialmore » resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.« less

  11. Near-field microwave microscopy of high-? oxides grown on graphene with an organic seeding layer

    SciTech Connect (OSTI)

    Tselev, Alexander Kalinin, Sergei V.; Sangwan, Vinod K.; Jariwala, Deep; Lauhon, Lincoln J.; Marks, Tobin J.; Hersam, Mark C.; Department of Chemistry, Northwestern University, Evanston, Illinois 60208

    2013-12-09

    Near-field scanning microwave microscopy (SMM) is used for non-destructive nanoscale characterization of Al{sub 2}O{sub 3} and HfO{sub 2} films grown on epitaxial graphene on SiC by atomic layer deposition using a self-assembled perylene-3,4,9,10-tetracarboxylic dianhydride seeding layer. SMM allows imaging of buried inhomogeneities in the dielectric layer with a spatial resolution close to 100?nm. The results indicate that, while topographic features on the substrate surface cannot be eliminated as possible sites of defect nucleation, the use of a vertically heterogeneous Al{sub 2}O{sub 3}/HfO{sub 2} stack suppresses formation of large outgrowth defects in the oxide film, ultimately improving lateral uniformity of the dielectric film.

  12. Hetero-epitaxial EuO interfaces studied by analytic electron microscopy

    SciTech Connect (OSTI)

    Mundy, Julia A.; Hodash, Daniel; Melville, Alexander; Held, Rainer; Mairoser, Thomas; Schmehl, Andreas; Muller, David A.; Kourkoutis, Lena F.; Schlom, Darrell G.

    2014-03-03

    With nearly complete spin polarization, the ferromagnetic semiconductor europium monoxide could enable next-generation spintronic devices by providing efficient ohmic spin injection into silicon. Spin injection is greatly affected by the quality of the interface between the injector and silicon. Here, we use atomic-resolution scanning transmission electron microscopy in conjunction with electron energy loss spectroscopy to directly image and chemically characterize a series of EuO|Si and EuO|YAlO{sub 3} interfaces fabricated using different growth conditions. We identify the presence of europium silicides and regions of disorder at the EuO|Si interfaces, imperfections that could significantly reduce spin injection efficiencies via spin-flip scattering.

  13. QUANTUM MECHANICS, GENERAL PHYSICS; 74 ATOMIC AND MOLECULAR PHYSICS...

    Office of Scientific and Technical Information (OSTI)

    of model atoms in fields Milonni, P.W. 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 74 ATOMIC AND MOLECULAR PHYSICS; ATOMS; OPTICAL MODELS; QUANTUM MECHANICS;...

  14. Micromechanism linear actuator with capillary force sealing

    DOE Patents [OSTI]

    Sniegowski, Jeffry J.

    1997-01-01

    A class of micromachine linear actuators whose function is based on gas driven pistons in which capillary forces are used to seal the gas behind the piston. The capillary forces also increase the amount of force transmitted from the gas pressure to the piston. In a major subclass of such devices, the gas bubble is produced by thermal vaporization of a working fluid. Because of their dependence on capillary forces for sealing, such devices are only practical on the sub-mm size scale, but in that regime they produce very large force times distance (total work) values.

  15. Dark Forces At The Tevatron

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Buckley, Matt; Fileviez Perez, Pavel; Hooper, Dan; Neil, Ethan

    2011-08-19

    A simple explanation of the W + dijet excess recently reported by the CDF collaboration involves the introduction of a new gauge boson with sizable couplings to quarks, but with no or highly suppressed couplings to leptons. Anomaly-free theories which include such a leptophobic gauge boson must also include additional particle content, which may include a stable and otherwise viable candidate for dark matter. Based on the couplings and mass of the Z` required to generate the CDF excess, we predict such a dark matter candidate to possess an elastic scattering cross section with nucleons on the order of σmore » ~ 10-40 cm2, providing a natural explanation for the signals reported by the CoGeNT and DAMA/LIBRA collaborations. In this light, CDF may be observing the gauge boson responsible for the force which mediates the interactions between the dark and visible matter of our universe.« less

  16. Largely defocused probe scanning transmission electron microscopy for imaging local modulation of strain field in a hetero interface

    SciTech Connect (OSTI)

    Kim, Suhyun Jung, Younheum; Kim, Joong Jung; Lee, Sunyoung; Lee, Haebum; Oshima, Yoshifumi

    2014-10-13

    We present an innovative method for characterizing the strain field in three dimensions in a hetero interface. Largely defocused probe scanning transmission electron microscopy (LDP-STEM) was employed for imaging the inhomogeneous strain field in a germanium (Ge) layer deposited on a silicon (Si) substrate. In the LDP-STEM image, Ge-atomic columns that are relaxed or strained to the Si substrate in the Si/Ge hetero interface were observed to be distinguishable, allowing for the qualitative characterization of the coherency of the crystal growth. Our results revealed that the strain field is locally modulated along the in-plane direction in the Si/Ge hetero interface.

  17. Mexico: swapping crude for atoms

    SciTech Connect (OSTI)

    Navarro, B.

    1982-06-24

    Mexico, considered the Saudi Arabia of the Western Hemisphere because of its proven and potential petroleum reserves, has surprised the world: it has embarked on the biggest nuclear-electric program in the Third World, only to postpone it days before scheduled approval of an international bidding (on which the atomic energy industry had pinned its hopes). A graph shows Mexican supplies of electricity by source with official projections to 1990. The point of entrance of the first nuclear reactor, originally scheduled for 1982, won't come onstream until 1983; and how nuclear-generated electricity grows close to 5% of the total in 1990. The big question is, will the future President of Mexico give the green light to the atomic megaproject. And if he does, how will Mexico deal with the serious logistics problems and grave ecological implications confronting the industry worldwide. In this issue, the author and Energy Detente touch on these questions and review the nuclear power status of Mexico, as well as addressing some of its global problems. Also presented in this issue is an update of the fuel price/tax series for the Western Hemisphere countries.

  18. Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy

    SciTech Connect (OSTI)

    Sutter, P. Sutter, E.

    2014-09-01

    We assess scanning electron microscopy (SEM) and Auger electron spectroscopy (AES) for thickness measurements on few-layer hexagonal boron nitride (h-BN), the layered dielectric of choice for integration with graphene and other two-dimensional materials. Observations on h-BN islands with large, atomically flat terraces show that the secondary electron intensity in SEM reflects monolayer height changes in films up to least 10 atomic layers thickness. From a quantitative analysis of AES data, the energy-dependent electron escape depth in h-BN films is deduced. The results show that AES is suitable for absolute thickness measurements of few-layer h-BN of 1 to 6 layers.

  19. Patterned arrays of capped platinum nanowires with quasi-elastic mechanical response to lateral force

    SciTech Connect (OSTI)

    Hottes, M. Muench, F.; Rauber, M.; Stegmann, C.; Ensinger, W.; Dassinger, F.; Schlaak, H. F.

    2015-02-02

    In this Letter, we describe the electrodeposition of capped, micro-sized Pt nanowire arrays in ion-track etched polymer templates and measure their collective mechanical response to an external force. By using an aperture mask during the irradiation process, it was possible to restrict the creation of pores in the templates to defined areas, allowing the fabrication of small nanowire arrays in different geometries and sizes. The simultaneous and highly reliable formation of many nanowire arrays was achieved using a pulsed electrodeposition technique. After deposition, the polymer matrix was removed using a gentle, dry oxygen plasma treatment, resulting in an excellent preservation of the array nanostructure as confirmed by scanning electron microscopy. A force measuring station was set up to perform mechanical characterization series on free-standing arrays. The nanowire arrays show a high robustness and respond sensitively to the applied force, making them attractive as spring elements in miniaturized inertial sensors, for example.

  20. Revealing the atomic and electronic structure of a SrTiO{sub 3}/LaNiO{sub 3}/SrTiO{sub 3} heterostructure interface

    SciTech Connect (OSTI)

    Zhang, Zaoli; Soltan, S.; Schmid, H.; Habermeier, H.-U.; Keimer, B.; Kaiser, U.

    2014-03-14

    The atomic structures of SrTiO{sub 3} (STO)/LaNiO{sub 3} (LNO)/STO heterostructure interfaces were investigated by spherical aberration-corrected (C{sub S}) (scanning) transmission electron microscopy. Atomic displacement and lattice distortion measurements and electron energy loss spectroscopy (EELS) were used to quantitatively analyze the distortion of the interfacial octahedra and the bond length at the interfaces. Combined with high-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy analyses, two distinct interfacial atomic terminating layers are unambiguously determined. Ensuing quantitative HRTEM measurements revealed that the Ni-O bond length in the interfacial octahedral is elongated at the bottom interface (NiO{sub 2}-SrO). Atomic displacement shows structural relaxation effects when crossing the interfaces and lattice distortions across the interface is more pronounced in LNO than in STO. The Ti/O atomic ratio, La and Ti relative atomic ratio as derived by EELS quantification indicate non-stoichiometric composition at the interfaces. Distinct fine structures of Ti-L{sub 2,3} edge and O-K edge at the bottom and top interfaces are observed. By comparison, we are able to estimate Ti valency at both interfaces. Combining the structural distortions and Ti valency, the polar discontinuity and charge transfer at the interfaces are discussed.

  1. Truman Signs Atomic Energy Act | National Nuclear Security Administration |

    National Nuclear Security Administration (NNSA)

    (NNSA) Truman Signs Atomic Energy Act Truman Signs Atomic Energy Act Washington, DC President Truman signs the Atomic Energy Act of 1946, leading to the creation of the Atomic Energy Commission

  2. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in...

  3. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing...

  4. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lensless Imaging of Magnetic Nanostructures Work performed on ALS Beamline 12.0.2.2 Citation: J.J. Turner et al., "X-Ray Diffraction Microscopy of Magnetic Structures," Phys....

  5. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in their ability to image with...

  6. Biological Imaging by Soft X-Ray Diffraction Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biological Imaging by Soft X-Ray Diffraction Microscopy Print Electron and x-ray microscopes are a valuable tool for both the life and materials sciences, but they are limited in ...

  7. X-Ray Diffraction Microscopy of Magnetic Structures

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    X-Ray Diffraction Microscopy of Magnetic Structures Print science brief icon Scientists working at ALS Beamline 12.0.2.2 have demonstrated a new x-ray technique for producing ...

  8. THz near-field microscopy of graphene structures. (Conference...

    Office of Scientific and Technical Information (OSTI)

    Title: THz near-field microscopy of graphene structures. Abstract not provided. Authors: Pan, Wei ; Brener, Igal ; Mitrofanov, O ; Thompson, R ; Yu, W ; berger, c ; de heer, w.a. ; ...

  9. Preparation of scanning tunneling microscopy tips using pulsed alternating current etching

    SciTech Connect (OSTI)

    Valencia, Victor A.; Thaker, Avesh A.; Derouin, Jonathan; Valencia, Damian N.; Farber, Rachael G.; Gebel, Dana A.; Killelea, Daniel R.

    2015-03-15

    An electrochemical method using pulsed alternating current etching (PACE) to produce atomically sharp scanning tunneling microscopy (STM) tips is presented. An Arduino Uno microcontroller was used to control the number and duration of the alternating current (AC) pulses, allowing for ready optimization of the procedures for both Pt:Ir and W tips using a single apparatus. W tips prepared using constant and pulsed AC power were compared. Tips fashioned using PACE were sharper than those etched with continuous AC power alone. Pt:Ir tips were prepared with an initial coarse etching stage using continuous AC power followed by fine etching using PACE. The number and potential of the finishing AC pulses was varied and scanning electron microscope imaging was used to compare the results. Finally, tip quality using the optimized procedures was verified by UHV-STM imaging. With PACE, at least 70% of the W tips and 80% of the Pt:Ir tips were of sufficiently high quality to obtain atomically resolved images of HOPG or Ni(111)

  10. Big Data and Deep data in scanning and electron microscopies: functionality from multidimensional data sets

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Belianinov, Alex; Vasudevan, Rama K; Strelcov, Evgheni; Steed, Chad A; Yang, Sang Mo; Tselev, Alexander; Jesse, Stephen; Biegalski, Michael D; Shipman, Galen M; Symons, Christopher T; et al

    2015-01-01

    The development of electron, and scanning probe microscopies in the second half of the twentieth century have produced spectacular images of internal structure and composition of matter with, at nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition and analysis. The progress in imaging technologies in the beginning of the twenty first century has opened the proverbial floodgates of high-veracity information on structure and functionality. High resolution imaging now allows information on atomic positions with picometer precision, allowing for quantitative measurements of individual bond length and angles. Functional imaging often leadsmore » to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this data into physically and chemically relevant information from imaging data.« less

  11. Authorize_Changes_Contractor_Work_Force_Restructuring_Policy...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    AuthorizeChangesContractorWorkForceRestructuringPolicy.pdf AuthorizeChangesContractorWorkForceRestructuringPolicy.pdf PDF icon AuthorizeChangesContractorWorkForceR...

  12. Integrated atomistic chemical imaging and reactive force field molecular dynamic simulations on silicon oxidation

    SciTech Connect (OSTI)

    Dumpala, Santoshrupa; Broderick, Scott R.; Rajan, Krishna; Khalilov, Umedjon; Neyts, Erik C.; Duin, Adri C. T. van; Provine, J; Howe, Roger T.

    2015-01-05

    In this paper, we quantitatively investigate with atom probe tomography, the effect of temperature on the interfacial transition layer suboxide species due to the thermal oxidation of silicon. The chemistry at the interface was measured with atomic scale resolution, and the changes in chemistry and intermixing at the interface were identified on a nanometer scale. We find an increase of suboxide (SiOx) concentration relative to SiO{sub 2} and increased oxygen ingress with elevated temperatures. Our experimental findings are in agreement with reactive force field molecular dynamics simulations. This work demonstrates the direct comparison between atom probe derived chemical profiles and atomistic-scale simulations for transitional interfacial layer of suboxides as a function of temperature.

  13. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  14. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  15. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  16. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  17. Localized surface plasmon assisted contrast microscopy for ultrathin transparent specimens

    SciTech Connect (OSTI)

    Wei, Feifei; Lu, Dylan; Aguinaldo, Ryan; Ma, Yicong; Sinha, Sunil K.; Liu, Zhaowei

    2014-10-20

    We demonstrate a high contrast imaging technique, termed localized surface plasmon assisted contrast microscopy, by combining localized surface plasmon resonances (LSPR) and dark-field microscopy technique. Due to the sensitive response of LSPR to the refractive index of the surrounding media, this technique is capable of converting a small refractive index difference to a change in scattering intensity, resulting in a high-contrast, diffraction limited image of a thin unstained specimen with small, gradual refractive-index variation.

  18. In-Situ Electron Microscopy of Electrical Energy Storage Materials |

    Broader source: Energy.gov (indexed) [DOE]

    Department of Energy 1 DOE Hydrogen and Fuel Cells Program, and Vehicle Technologies Program Annual Merit Review and Peer Evaluation es095_unocic_2011_o.pdf (1.17 MB) More Documents & Publications In-Situ Electron Microscopy of Electrical Energy Storage Materials In-Situ Electron Microscopy of Electrical Energy Storage Materials In-situ characterization and diagnostics of mechanical degradation in electrodes

  19. Scanning Transmission Electron Microscopy Investigations of Complex Oxides

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    | Stanford Synchrotron Radiation Lightsource Scanning Transmission Electron Microscopy Investigations of Complex Oxides Monday, May 23, 2011 - 3:30pm SSRL Conference room 137-322 Professor Tom Vogt, NanoCenter & Department of Chemistry, University of South Carolina High-Angle-Annular-Dark-Field/Scanning Transmission Electron Microscopy (HAADF/STEM) is a technique uniquely suited for detailed studies of the structure and composition of complex oxides. The HAADF detector collects electrons

  20. Ultra-High Resolution Electron Microscopy for Catalyst Characterization |

    Broader source: Energy.gov (indexed) [DOE]

    Department of Energy lm034_rohatgi_2011_o.pdf (1.05 MB) More Documents & Publications Vehicle Technologies Office: 2010 Lightweight Materials R&D Annual Progress Report Nanostructured Materials by Machining 2011 Annual Progress Report for Lightweighting Materials Department of Energy

    pm029_allard_2011_p.pdf (2.39 MB) More Documents & Publications Ultra-High Resolution Electron Microscopy for Catalyst Characterization Ultra-high Resolution Electron Microscopy for Catalyst

  1. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  2. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  3. Record-Setting Microscopy Illuminates Energy Storage Materials

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Record-Setting Microscopy Illuminates Energy Storage Materials Print X-ray microscopy is powerful in that it can probe large volumes of material at high spatial resolution with exquisite chemical, electronic, and bond orientation contrast. The development of diffraction-based methods such as ptychography has, in principle, removed the resolution limit imposed by the characteristics of the x-ray optics. Using soft x-ray ptychography, researchers at the ALS have demonstrated the highest-resolution

  4. Casimir force between integrable and chaotic pistons

    SciTech Connect (OSTI)

    Alvarez, Ezequiel; Mazzitelli, Francisco D.; Wisniacki, Diego A. [Departamento de Fisica, Facultad de Ciencias Exactas y Naturales Universidad de Buenos Aires, and Instituto de Fisica de Buenos Aires, Concejo Nacional de Investigaciones Cientificas y Tecnicas, Ciudad Universitaria, Pabellon I, 1428 Buenos Aires (Argentina); Monastra, Alejandro G. [Gerencia de Investigacion y Aplicaciones, Comision Nacional de Energia Atomica, Concejo Nacional de Investigaciones Cientificas y Tecnicas, Avenida General Paz 1499, 1650 San Martin (Argentina)

    2010-11-15

    We have computed numerically the Casimir force between two identical pistons inside a very long cylinder, considering different shapes for the pistons. The pistons can be considered quantum billiards, whose spectrum determines the vacuum force. The smooth part of the spectrum fixes the force at short distances and depends only on geometric quantities like the area or perimeter of the piston. However, correcting terms to the force, coming from the oscillating part of the spectrum which is related to the classical dynamics of the billiard, could be qualitatively different for classically integrable or chaotic systems. We have performed a detailed numerical analysis of the corresponding Casimir force for pistons with regular and chaotic classical dynamics. For a family of stadium billiards, we have found that the correcting part of the Casimir force presents a sudden change in the transition from regular to chaotic geometries. This suggests that there could be signatures of quantum chaos in the Casimir effect.

  5. The Manhattan Project: Making the Atomic Bomb | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    The Manhattan Project: Making the Atomic Bomb The Manhattan Project: Making the Atomic Bomb This report is an account of work on the atomic bomb. The Manhattan Project: Making the Atomic Bomb (6.17 MB) More Documents & Publications Gosling, The Manhattan Project: Making the Atomic Bomb The_Manhattan_Project_2010.pdf The Manhattan Project: Making of the Atomic Bomb

  6. Protective Forces | National Nuclear Security Administration | (NNSA)

    National Nuclear Security Administration (NNSA)

    Protective Forces NNSA has some of the best trained and best equipped forces protecting its nuclear weapons and material. Since the events of September 11, 2001, NNSA has hired additional armed security police officers. It has also shifted towards a paramilitary, "tactical response force" that utilizes a robust mix of offensive and defensive qualified officers who are well-trained in small team and weapons tactics. It has improved its training capabilities by expanding training ranges

  7. ARM - PI Product - Direct Aerosol Forcing Uncertainty

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ProductsDirect Aerosol Forcing Uncertainty ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send PI Product : Direct Aerosol Forcing Uncertainty Understanding sources of uncertainty in aerosol direct radiative forcing (DRF), the difference in a given radiative flux component with and without aerosol, is essential to quantifying changes in Earth's radiation budget. We examine the uncertainty in DRF due to measurement

  8. Method for enhanced atomization of liquids

    DOE Patents [OSTI]

    Thompson, Richard E.; White, Jerome R.

    1993-01-01

    In a process for atomizing a slurry or liquid process stream in which a slurry or liquid is passed through a nozzle to provide a primary atomized process stream, an improvement which comprises subjecting the liquid or slurry process stream to microwave energy as the liquid or slurry process stream exits the nozzle, wherein sufficient microwave heating is provided to flash vaporize the primary atomized process stream.

  9. Atomicity violation detection using access interleaving invariants

    DOE Patents [OSTI]

    Zhou, Yuanyuan; Lu, Shan; Tucek, Joseph Andrew

    2013-09-10

    During execution of a program, the situation where the atomicity of a pair of instructions that are to be executed atomically is violated is identified, and a bug is detected as occurring in the program at the pair of instructions. The pairs of instructions that are to be executed atomically can be identified in different manners, such as by executing a program multiple times and using the results of those executions to automatically identify the pairs of instructions.

  10. Integrated Nanosystems for Atomically Precise Manufacturing Workshop -

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    August 5-6, 2015 | Department of Energy Nanosystems for Atomically Precise Manufacturing Workshop - August 5-6, 2015 Integrated Nanosystems for Atomically Precise Manufacturing Workshop - August 5-6, 2015 The US Department of Energy (DOE) Advanced Manufacturing Office (AMO) hosted a Workshop on Integrated Nanosystems for Atomically Precise Manufacturing (INFAPM) in Berkeley, California, August 5-6, 2015. DOE invited representatives from academia, national labs, the Executive Office of the

  11. Collisionally induced atomic clock shifts and correlations

    SciTech Connect (OSTI)

    Band, Y. B.; Osherov, I.

    2011-07-15

    We develop a formalism to incorporate exchange symmetry considerations into the calculation of collisional frequency shifts for atomic clocks using a density-matrix formalism. The formalism is developed for both fermionic and bosonic atomic clocks. Numerical results for a finite-temperature {sup 87}Sr {sup 1}S{sub 0} (F=9/2) atomic clock in a magic wavelength optical lattice are presented.

  12. Sandia Energy - Air Force Research Laboratory Testing

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    from the Air Force Research Laboratory in Albuquerque utilized the site at the National Solar Thermal Test Facility to evaluate seismic and optical activity from explosives set...

  13. Sandia Energy - Air Force Research Laboratory Testing

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    the Air Force Research Laboratory (AFRL) in Albuquerque utilized the site at the National Solar Thermal Test Facility (NSTTF) to evaluate seismic and optical activity from...

  14. Weardale Task Force | Open Energy Information

    Open Energy Info (EERE)

    that is developing a sustainable community in the East gate area which will be run on wind, solar, biomass, geothermal and hydro power. References: Weardale Task Force1...

  15. Nuclear Radiological Threat Task Force Established | National...

    National Nuclear Security Administration (NNSA)

    Nuclear Radiological Threat Task Force Established Washington, DC NNSA's Administrator Linton Brooks announces the establishment of the Nuclear Radiological Threat Reduction Task ...

  16. Interagency Energy Management Task Force Members

    Broader source: Energy.gov [DOE]

    The Interagency Energy Management Task Force is led by the Federal Energy Management Program director. Members include energy and sustainability managers from federal agencies.

  17. Elastic actuator for precise force control

    DOE Patents [OSTI]

    Pratt, G.A.; Williamson, M.M.

    1997-07-22

    The invention provides an elastic actuator consisting of a motor and a motor drive transmission connected at an output of the motor. An elastic element is connected in series with the motor drive transmission, and this elastic element is positioned to alone support the full weight of any load connected at an output of the actuator. A single force transducer is positioned at a point between a mount for the motor and an output of the actuator. This force transducer generates a force signal, based on deflection of the elastic element, that indicates force applied by the elastic element to an output of the actuator. An active feedback force control loop is connected between the force transducer and the motor for controlling the motor. This motor control is based on the force signal to deflect the elastic element an amount that produces a desired actuator output force. The produced output force is substantially independent of load motion. The invention also provides a torsional spring consisting of a flexible structure having at least three flat sections each connected integrally with and extending radially from a central section. Each flat section extends axially along the central section from a distal end of the central section to a proximal end of the central section. 30 figs.

  18. Elastic actuator for precise force control

    DOE Patents [OSTI]

    Pratt, Gill A.; Williamson, Matthew M.

    1997-07-22

    The invention provides an elastic actuator consisting of a motor and a motor drive transmission connected at an output of the motor. An elastic element is connected in series with the motor drive transmission, and this elastic element is positioned to alone support the full weight of any load connected at an output of the actuator. A single force transducer is positioned at a point between a mount for the motor and an output of the actuator. This force transducer generates a force signal, based on deflection of the elastic element, that indicates force applied by the elastic element to an output of the actuator. An active feedback force control loop is connected between the force transducer and the motor for controlling the motor. This motor control is based on the force signal to deflect the elastic element an amount that produces a desired actuator output force. The produced output force is substantially independent of load motion. The invention also provides a torsional spring consisting of a flexible structure having at least three flat sections each connected integrally with and extending radially from a central section. Each flat section extends axially along the central section from a distal end of the central section to a proximal end of the central section.

  19. Super-Stable, Highly Monodisperse Plasmonic Nanocrystals with 500 Gold Atoms: Au~500(SR)~120

    SciTech Connect (OSTI)

    Kumara, Chanaka; Zuo, Xiaobing; Ilavsky, Dr. Jan; Chapman, Karena; Cullen, David A; Dass, Amala

    2014-01-01

    Determining the composition of plasmonic nanoparticles is challenging due to a deficiency in tools capable of accurately evaluating the number of atoms. Mass spectrometry plays a significant role in determining nanoparticle composition at the atomic level. Significant progress has been made in understanding ultra-small gold nanoparticles, like Au25(SR)18 and Au38(SR)24, with a Au core diameter of 0.97 and 1.3 nm, respectively. However, progress in small plasmonic nanoparticles (2 - 5 nm) is currently challenging, due in part to limitations in synthesizing monodisperse nanoparticles. Here, we report a plasmonic nanocrystal that is highly monodisperse, with an unprecedented variation of less than 20 gold atoms. The composition of the super-stable plasmonic nanocrystals at 115 kDa was determined to contain Au500 10SR120 3. The Au~500 system, named Faraduarate-500, is the largest size to be characterized using high resolution ESI mass spectrometry. Atomic pair distribution function (PDF) data shows that the local atomic structure is consistent with a face-centered cubic (fcc) or Marks decahedral arrangement. High resolution scanning transmission electron microscopy images show that the diameter is 2.4 0.1 nm. The radius of gyration measured by small angle X-ray scattering (SAXS), is 1.05 0.05 nm, and the size and the shape of SAXS molecular envelope are in agreement with TEM and PDF measurements.

  20. Chemical Quantification of Atomic-Scale EDS Maps under Thin Specimen Conditions

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Lu, Ping; Romero, Eric; Lee, Shinbuhm; MacManus-Driscoll, Judith L.; Jia, Quanxi

    2014-10-13

    We report our effort to quantify atomic-scale chemical maps obtained by collecting energy-dispersive X-ray spectra (EDS) using scanning transmission electron microscopy (STEM) (STEM-EDS). Under a thin specimen condition and when the EDS scattering potential is localized, the X-ray counts from atomic columns can be properly counted by fitting Gaussian peaks at the atomic columns, and can then be used for site-by-site chemical quantification. The effects of specimen thickness and X-ray energy on the Gaussian peak-width are investigated by using SrTiO3 (STO) as a model specimen. The relationship between the peak-width and spatial-resolution of an EDS map is also studied. Furthermore,more » the method developed by this work is applied to study a Sm-doped STO thin film and antiphase boundaries present within the STO film. We find that Sm atoms occupy both Sr and Ti sites but preferably the Sr sites, and Sm atoms are relatively depleted at the antiphase boundaries likely due to the effect of strain.« less