National Library of Energy BETA

Sample records for atomic force microscope

  1. Atomic Force Microscope

    SciTech Connect (OSTI)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  2. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2006-08-22

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  3. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V.; Wang, Chengpu

    2004-11-16

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  4. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2003-01-01

    An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

  5. Hyperbaric Hydrothermal Atomic Force Microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2003-07-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  6. Hyperbaric hydrothermal atomic force microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2002-01-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  7. A new ion sensing deep atomic force microscope

    SciTech Connect (OSTI)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  8. A metrological large range atomic force microscope with improved performance

    SciTech Connect (OSTI)

    Dai, Gaoliang; Wolff, Helmut; Pohlenz, Frank; Danzebrink, Hans-Ulrich

    2009-04-15

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument.

  9. Free vibrations of U-shaped atomic force microscope probes

    SciTech Connect (OSTI)

    Rezaei, E.; Turner, J. A.

    2014-05-07

    Contact resonance atomic force microscope (AFM) methods have been used to quantify the elastic and viscoelastic properties of a variety of materials such as polymers, ceramics, biological materials, and metals with spatial resolution on the order of tens of nanometers. This approach involves measurement of the resonant frequencies of the AFM probe both for the free case and the case for which the tip is in contact with a sample. Vibration models of the probe and tip-sample contact models are then used to determine the sample properties from the frequency behavior and to create images of the sample properties. This work has been primarily focused on rectangular, single-beam probes for which the vibration models are relatively simple. Recently, U-shaped AFM probes have been developed to allow local heating of samples and the resonances of these probes are much more complex. In this article, a simplified analytical model of these U-shaped probes is described. This three beam model includes two beams clamped at one end and connected with a perpendicular cross beam at the other end. The beams are assumed only to bend in flexure and twist but their coupling allows a wide range of possible dynamic behavior. Results are presented for the first ten modes and the mode shapes are shown to have complex coupling between the flexure and twisting of the beams, particularly for the higher modes. All resonant frequency results are in good agreement with finite element results for the three probe designs and two values of thickness considered (all wavenumbers are within 3.0%). This work is anticipated to allow U-shaped probes to be used eventually for quantitative measurements of sample material properties during heating using a contact resonance approach.

  10. Model based control of dynamic atomic force microscope

    SciTech Connect (OSTI)

    Lee, Chibum; Salapaka, Srinivasa M.

    2015-04-15

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H{sub ∞} control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  11. Photothermal excitation setup for a modified commercial atomic force microscope

    SciTech Connect (OSTI)

    Adam, Holger; Rode, Sebastian; Schreiber, Martin; Kühnle, Angelika; Kobayashi, Kei; Yamada, Hirofumi

    2014-02-15

    High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and to maintain the low noise level of the original setup with a typical deflection noise density of about 15 fm/√(Hz) measured in aqueous solution. The success of the modification is illustrated by a comparison of the resonance spectra obtained with piezoelectric and photothermal excitation. The performance of the systems is demonstrated by presenting high-resolution images on bare calcite in liquid as well as organic adsorbates (Alizarin Red S) on calcite with simultaneous atomic resolution of the underlying calcite substrate.

  12. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    DOE Patents [OSTI]

    Fink, Samuel D.; Fondeur, Fernando F.

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  13. Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

    SciTech Connect (OSTI)

    Torun, H.; Torello, D.; Degertekin, F. L.

    2011-08-15

    The authors describe a method of actuation for atomic force microscope (AFM) probes to improve imaging speed and displacement range simultaneously. Unlike conventional piezoelectric tube actuation, the proposed method involves a lever and fulcrum ''seesaw'' like actuation mechanism that uses a small, fast piezoelectric transducer. The lever arm of the seesaw mechanism increases the apparent displacement range by an adjustable gain factor, overcoming the standard tradeoff between imaging speed and displacement range. Experimental characterization of a cantilever holder implementing the method is provided together with comparative line scans obtained with contact mode imaging. An imaging bandwidth of 30 kHz in air with the current setup was demonstrated.

  14. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect (OSTI)

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  15. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    SciTech Connect (OSTI)

    Labuda, Aleksander; Proksch, Roger

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  16. Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

    SciTech Connect (OSTI)

    Evans, J. Chapman, S.

    2014-08-14

    Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided.

  17. High-speed atomic force microscope based on an astigmatic detection system

    SciTech Connect (OSTI)

    Liao, H.-S.; Chen, Y.-H.; Hwu, E.-T.; Chang, C.-S.; Hwang, I.-S.; Ding, R.-F.; Huang, H.-F.; Wang, W.-M.; Huang, K.-Y.

    2014-10-15

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  18. Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope

    SciTech Connect (OSTI)

    Kuwahara, Masashi; Abe, Hidekazu; Tokumoto, Hiroshi; Shima, Takayuki; Tominaga, Junji; Fukuda, Hajime

    2004-03-15

    A carbon nanotube (CNT) was successfully attached to a base probe with a blunt apex and subsequently used as a probe for an atomic force microscope (AFM). This setup demonstrates high spatial resolution properties, plus an advantage: we were able to readily identify the loss of the CNT from the end of the probe by the resultant sudden drop in resolution. This design of probe is expected to feature yet another advantage: that of relative immunity to accidental collision compared to a CNT attached to a commercially available sharp tip. We also discuss the problems specific to CNT-attached probes, which are carbon contamination of the sample surface and artifact images formed at the edge of pit structures. We demonstrate that carbon contamination can be suppressed by a rubbing procedure before the scanning use, and that pit artifacts can be eliminated by optimizing the CNT length.

  19. Note: Calibration of atomic force microscope cantilevers using only their resonant frequency and quality factor

    SciTech Connect (OSTI)

    Sader, John E.; Friend, James R.

    2014-11-15

    A simplified method for calibrating atomic force microscope cantilevers was recently proposed by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012); Sec. III D] that relies solely on the resonant frequency and quality factor of the cantilever in fluid (typically air). This method eliminates the need to measure the hydrodynamic function of the cantilever, which can be time consuming given the wide range of cantilevers now available. Using laser Doppler vibrometry, we rigorously assess the accuracy of this method for a series of commercially available cantilevers and explore its performance under non-ideal conditions. This shows that the simplified method is highly accurate and can be easily implemented to perform fast, robust, and non-invasive spring constant calibration.

  20. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    SciTech Connect (OSTI)

    Karc?, zgr; Dede, Mnir

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ~12 fm/?Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  1. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope

    SciTech Connect (OSTI)

    Sader, John E.; Lu, Jianing; Mulvaney, Paul

    2014-11-15

    Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

  2. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties

    SciTech Connect (OSTI)

    Boudaoud, Mokrane; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe

    2012-01-15

    The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration techniques, the thermal calibration is one of the simplest and fastest methods for the dynamic characterization of an AFM cantilever. This method is efficient provided that the Brownian motion (thermal noise) is the most important source of excitation during the calibration process. Otherwise, the value of spring constant is underestimated. This paper investigates noise interference ranges in low stiffness AFM cantilevers taking into account thermal fluctuations and acoustic pressures as two main sources of noise. As a result, a preliminary knowledge about the conditions in which thermal fluctuations and acoustic pressures have closely the same effect on the AFM cantilever (noise interference) is provided with both theoretical and experimental arguments. Consequently, beyond the noise interference range, commercial low stiffness AFM cantilevers are calibrated in two ways: using the thermal noise (in a wide temperature range) and acoustic pressures generated by a loudspeaker. We then demonstrate that acoustic noises can also be used for an efficient characterization and calibration of low stiffness AFM cantilevers. The accuracy of the acoustic characterization is evaluated by comparison with results from the thermal calibration.

  3. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

    SciTech Connect (OSTI)

    Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; Lange, Dorus de; Sadeghian, Hamed E-mail: h.sadeghianmarnani@tudelft.nl

    2015-11-15

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

  4. Spatial dependence of polycrystalline FTOs conductance analyzed by conductive atomic force microscope (C-AFM)

    SciTech Connect (OSTI)

    Peixoto, Alexandre Pessoa; Costa, J. C. da

    2014-05-15

    Fluorine-doped Tin oxide (FTO) is a highly transparent, electrically conductive polycrystalline material frequently used as an electrode in organic solar cells and optical-electronic devices [12]. In this work a spatial analysis of the conductive behavior of FTO was carried out by Conductive-mode Atomic Force Microscopy (C-AFM). Rare highly oriented grains sample give us an opportunity to analyze the top portion of polycrystalline FTO and compare with the border one. It is shown that the current flow essentially takes place through the polycrystalline edge at grain boundaries.

  5. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    SciTech Connect (OSTI)

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanners fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the ?{sub 3}?{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ?7 frames/s.

  6. Uncertainty in least-squares fits to the thermal noise spectra of nanomechanical resonators with applications to the atomic force microscope

    SciTech Connect (OSTI)

    Sader, John E.; Yousefi, Morteza; Friend, James R.; Melbourne Centre for Nanofabrication, Clayton, Victoria 3800

    2014-02-15

    Thermal noise spectra of nanomechanical resonators are used widely to characterize their physical properties. These spectra typically exhibit a Lorentzian response, with additional white noise due to extraneous processes. Least-squares fits of these measurements enable extraction of key parameters of the resonator, including its resonant frequency, quality factor, and stiffness. Here, we present general formulas for the uncertainties in these fit parameters due to sampling noise inherent in all thermal noise spectra. Good agreement with Monte Carlo simulation of synthetic data and measurements of an Atomic Force Microscope (AFM) cantilever is demonstrated. These formulas enable robust interpretation of thermal noise spectra measurements commonly performed in the AFM and adaptive control of fitting procedures with specified tolerances.

  7. Macroscopic model of scanning force microscope

    DOE Patents [OSTI]

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  8. In situ atomic force microscope study of high-temperature untwinning surface relief in Mn-Fe-Cu antiferromagnetic shape memory alloy

    SciTech Connect (OSTI)

    Wang, L.; Cui, Y. G.; Wan, J. F.; Rong, Y. H.; Zhang, J. H.; Jin, X.; Cai, M. M.

    2013-05-06

    The N-type untwinning surface relief associated with the fcc {r_reversible} fct martensitic transformation (MT) was observed in the Mn{sub 81.5}Fe{sub 14.0}Cu{sub 4.5} antiferromagnetic high-temperature shape memory alloy (SMA) by in situ atomic force microscopy. The measured untwinning relief angles ({theta}{sub {alpha}} Double-Vertical-Line {theta}{sub {beta}}) at the ridge and at the valley were different, and both angles were less than the conventional values. The surface relief exhibited good reversibility during heating and cooling because of the crystallographic reversibility of thermal-elastic SMAs. Untwinning shear was proposed as the main mechanism of the N-type surface relief. The order of the reverse MT was discussed based on the experimental measurements.

  9. Effect of homolog doping on surface morphology and mass-loss rates from PETN crystals. Studies using atomic force microscope and thermo-gravimetric analysis

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Bhattacharya, S. K.; Maiti, A; Gee, R. H.; Nunley, J.; Weeks, B. L.

    2012-08-28

    Pentaerythritol tetranitrate (PETN) is an important energetic material and its performance as a secondary explosive depends strongly on the density as well as flow porosity of powdered material, which in turn is governed by the size and surface properties of the PETN crystallite particles. Historically there has been evidence that the surface properties of PETN particles can be strongly influenced by the presence of homolog impurities of PETN, in particular, dipentaerythritol hexanitrate (diPEHN) and tripentaerythritol octanitrate (triPEON), although not many systematic studies characterizing such influence exist. In this work we employ thermogravimetric analysis (TGA) to measure mass-loss rates at elevatedmore » temperatures and show that doping with a small amount of diPEHN and triPEON can reduce the mass-loss rate from PETN single-crystal surfaces by as much as 35 % as compared to undoped crystals. Arrhenius plots of mass-loss rates as a function of temperature suggest that the reduction in evaporation is not due to the change in activation barrier of the molecular evaporation process, but perhaps due to the impedance to the receding motion of the steps by the immobile impurities on the surface. Removal of surface impurities through gentle washing with ethanol leads to enhanced mass-loss rate relative to pure PETN suggesting a roughened surface morphology. Some surface roughening in doped crystals is supported by Atomic force microscopy (AFM) images of growth layers that show evidences of growth layer stacking and rough edges. Furthermore, we find that a larger amount of impurity added to the original solution does not necessarily lead to a more highly doped crystal, which could perhaps be interpreted as PETN crystals being able to accommodate only up to a certain weight percent of homolog impurities.« less

  10. Atomically resolved force microscopy at room temperature

    SciTech Connect (OSTI)

    Morita, Seizo

    2014-04-24

    Atomic force microscopy (AFM) can now not only image individual atoms but also construct atom letters using atom manipulation method even at room temperature (RT). Therefore, the AFM is the second generation atomic tool following the scanning tunneling microscopy (STM). However the AFM can image even insulating atoms, and also directly measure/map the atomic force and potential at the atomic scale. Noting these advantages, we have been developing a bottom-up nanostructuring system at RT based on the AFM. It can identify chemical species of individual atoms and then manipulate selected atom species to the predesigned site one-by-one to assemble complex nanostructures consisted of multi atom species at RT. Here we introduce our results toward atom-by-atom assembly of composite nanostructures based on the AFM at RT including the latest result on atom gating of nano-space for atom-by-atom creation of atom clusters at RT for semiconductor surfaces.

  11. NREL: Measurements and Characterization - Atomic Force Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Force Microscopy Atomic Force Microscopy (AFM) operates in several modes. In contact mode, a tip that is attached to a cantilever is scanned over the sample surface, while the force between tip and sample is measured. While the tip is scanned laterally, the force is kept constant by moving the cantilever/tip assembly up and down, so that the deflection of the cantilever is kept constant. The vertical movement of the cantilever/tip assembly is recorded and used to generate an image of the

  12. Versatile atomic force microscopy setup combined with micro-focused X-ray beam

    SciTech Connect (OSTI)

    Slobodskyy, T. Tholapi, R.; Liefeith, L.; Hansen, W.; Zozulya, A. V. Fester, M.; Sprung, M.

    2015-06-15

    Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.

  13. Fidelity imaging for atomic force microscopy

    SciTech Connect (OSTI)

    Ghosal, Sayan Salapaka, Murti

    2015-01-05

    Atomic force microscopy is widely employed for imaging material at the nanoscale. However, real-time measures on image reliability are lacking in contemporary atomic force microscopy literature. In this article, we present a real-time technique that provides an image of fidelity for a high bandwidth dynamic mode imaging scheme. The fidelity images define channels that allow the user to have additional authority over the choice of decision threshold that facilitates where the emphasis is desired, on discovering most true features on the sample with the possible detection of high number of false features, or emphasizing minimizing instances of false detections. Simulation and experimental results demonstrate the effectiveness of fidelity imaging.

  14. Friction forces on atoms after acceleration

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Intravaia, Francesco; Mkrtchian, Vanik E.; Buhmann, Stefan Yoshi; Scheel, Stefan; Dalvit, Diego A. R.; Henkel, Carsten

    2015-05-12

    The aim of this study is to revisit the calculation of atom–surface quantum friction in the quantum field theory formulation put forward by Barton (2010 New J. Phys. 12 113045). We show that the power dissipated into field excitations and the associated friction force depend on how the atom is boosted from being initially at rest to a configuration in which it is moving at constant velocity (v) parallel to the planar interface. In addition, we point out that there is a subtle cancellation between the one-photon and part of the two-photon dissipating power, resulting in a leading order contributionmore » to the frictional power which goes as v4. These results are also confirmed by an alternative calculation of the average radiation force, which scales as v3.« less

  15. Friction forces on atoms after acceleration

    SciTech Connect (OSTI)

    Intravaia, Francesco; Mkrtchian, Vanik E.; Buhmann, Stefan Yoshi; Scheel, Stefan; Dalvit, Diego A. R.; Henkel, Carsten

    2015-05-12

    The aim of this study is to revisit the calculation of atom–surface quantum friction in the quantum field theory formulation put forward by Barton (2010 New J. Phys. 12 113045). We show that the power dissipated into field excitations and the associated friction force depend on how the atom is boosted from being initially at rest to a configuration in which it is moving at constant velocity (v) parallel to the planar interface. In addition, we point out that there is a subtle cancellation between the one-photon and part of the two-photon dissipating power, resulting in a leading order contribution to the frictional power which goes as v4. These results are also confirmed by an alternative calculation of the average radiation force, which scales as v3.

  16. Laser interferometry force-feedback sensor for an interfacial force microscope

    DOE Patents [OSTI]

    Houston, Jack E.; Smith, William L.

    2004-04-13

    A scanning force microscope is provided with a force-feedback sensor to increase sensitivity and stability in determining interfacial forces between a probe and a sample. The sensor utilizes an interferometry technique that uses a collimated light beam directed onto a deflecting member, comprising a common plate suspended above capacitor electrodes situated on a substrate forming an interference cavity with a probe on the side of the common plate opposite the side suspended above capacitor electrodes. The probe interacts with the surface of the sample and the intensity of the reflected beam is measured and used to determine the change in displacement of the probe to the sample and to control the probe distance relative to the surface of the sample.

  17. Ultrasonic-Based Mode-Synthesizing Atomic Force Microscopy -...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Only ultrasonic-based atomic force microscopy in the industry Sufficiently flexible for compatibility with spectroscopic approaches such as Raman spectroscopy Easily adaptable to ...

  18. Phase contrast and operation regimes in multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Santos, Sergio

    2014-04-07

    In amplitude modulation atomic force microscopy the attractive and the repulsive force regimes induce phase shifts above and below 90°, respectively. In the more recent multifrequency approach, however, multiple operation regimes have been reported and the theory should be revisited. Here, a theory of phase contrast in multifrequency atomic force microscopy is developed and discussed in terms of energy transfer between modes, energy dissipation and the kinetic energy and energy transfer associated with externally driven harmonics. The single frequency virial that controls the phase shift might undergo transitions in sign while the average force (modal virial) remains positive (negative)

  19. Workshop on Atomic Force Microscopy, Nanometrology and More ...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Swarna Addepalli 2012.12.17 One of my colleagues from our global research center in India, K.G. V. Siva Kumar (Sivakumar), recently attended a workshop on Atomic Force...

  20. Autopilot for frequency-modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kuchuk, Kfir; Schlesinger, Itai; Sivan, Uri

    2015-10-15

    One of the most challenging aspects of operating an atomic force microscope (AFM) is finding optimal feedback parameters. This statement applies particularly to frequency-modulation AFM (FM-AFM), which utilizes three feedback loops to control the cantilever excitation amplitude, cantilever excitation frequency, and z-piezo extension. These loops are regulated by a set of feedback parameters, tuned by the user to optimize stability, sensitivity, and noise in the imaging process. Optimization of these parameters is difficult due to the coupling between the frequency and z-piezo feedback loops by the non-linear tip-sample interaction. Four proportional-integral (PI) parameters and two lock-in parameters regulating these loops require simultaneous optimization in the presence of a varying unknown tip-sample coupling. Presently, this optimization is done manually in a tedious process of trial and error. Here, we report on the development and implementation of an algorithm that computes the control parameters automatically. The algorithm reads the unperturbed cantilever resonance frequency, its quality factor, and the z-piezo driving signal power spectral density. It analyzes the poles and zeros of the total closed loop transfer function, extracts the unknown tip-sample transfer function, and finds four PI parameters and two lock-in parameters for the frequency and z-piezo control loops that optimize the bandwidth and step response of the total system. Implementation of the algorithm in a home-built AFM shows that the calculated parameters are consistently excellent and rarely require further tweaking by the user. The new algorithm saves the precious time of experienced users, facilitates utilization of FM-AFM by casual users, and removes the main hurdle on the way to fully automated FM-AFM.

  1. Using Atom Interferometry to Search for New Forces

    SciTech Connect (OSTI)

    Wacker, Jay G.; /SLAC

    2009-12-11

    Atom interferometry is a rapidly advancing field and this Letter proposes an experiment based on existing technology that can search for new short distance forces. With current technology it is possible to improve the sensitivity by up to a factor of 10{sup 2} and near-future advances will be able to rewrite the limits for forces with ranges from 100 {micro}m to 1km.

  2. Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

    SciTech Connect (OSTI)

    Miccio, Luis A. Colmenero, Juan; Kummali, Mohammed M.; Alegra, ngel; Schwartz, Gustavo A.

    2014-05-14

    The use of an atomic force microscope for studying molecular dynamics through dielectric spectroscopy with spatial resolution in the nanometer scale is a recently developed approach. However, difficulties in the quantitative connection of the obtained data and the material dielectric properties, namely, frequency dependent dielectric permittivity, have limited its application. In this work, we develop a simple electrical model based on physically meaningful parameters to connect the atomic force microscopy (AFM) based dielectric spectroscopy experimental results with the material dielectric properties. We have tested the accuracy of the model and analyzed the relevance of the forces arising from the electrical interaction with the AFM probe cantilever. In this way, by using this model, it is now possible to obtain quantitative information of the local dielectric material properties in a broad frequency range. Furthermore, it is also possible to determine the experimental setup providing the best sensitivity in the detected signal.

  3. Electromagnetic model for near-field microwave microscope with atomic resolution: Determination of tunnel junction impedance

    SciTech Connect (OSTI)

    Reznik, Alexander N.

    2014-08-25

    An electrodynamic model is proposed for the tunneling microwave microscope with subnanometer space resolution as developed by Lee et al. [Appl. Phys. Lett. 97, 183111 (2010)]. Tip-sample impedance Z{sub a} was introduced and studied in the tunneling and non-tunneling regimes. At tunneling breakdown, the microwave current between probe and sample flows along two parallel channels characterized by impedances Z{sub p} and Z{sub t} that add up to form overall impedance Z{sub a}. Quantity Z{sub p} is the capacitive impedance determined by the near field of the probe and Z{sub t} is the impedance of the tunnel junction. By taking into account the distance dependences of effective tip radius r{sub 0}(z) and tunnel resistance R{sub t}(z)?=?Re[Z{sub t}(z)], we were able to explain the experimentally observed dependences of resonance frequency f{sub r}(z) and quality factor Q{sub L}(z) of the microscope. The obtained microwave resistance R{sub t}(z) and direct current tunnel resistance R{sub t}{sup dc}(z) exhibit qualitatively similar behavior, although being largely different in both magnitude and the characteristic scale of height dependence. Interpretation of the microwave images of the atomic structure of test samples proved possible by taking into account the inductive component of tunnel impedance ImZ{sub t}?=??L{sub t}. Relation ?L{sub t}/R{sub t}???0.235 was obtained.

  4. Atomic force microscopy investigation of the giant mimivirus

    SciTech Connect (OSTI)

    Kuznetsov, Yuri G.; Xiao Chuan; Sun Siyang; Raoult, Didier; Rossmann, Michael; McPherson, Alexander

    2010-08-15

    Mimivirus was investigated by atomic force microscopy in its native state following serial degradation by lysozyme and bromelain. The 750-nm diameter virus is coated with a forest of glycosylated protein fibers of lengths about 140 nm with diameters 1.4 nm. Fibers are capped with distinctive ellipsoidal protein heads of estimated Mr = 25 kDa. The surface fibers are attached to the particle through a layer of protein covering the capsid, which is in turn composed of the major capsid protein (MCP). The latter is organized as an open network of hexagonal rings with central depressions separated by 14 nm. The virion exhibits an elaborate apparatus at a unique vertex, visible as a star shaped depression on native particles, but on defibered virions as five arms of 50 nm width and 250 nm length rising above the capsid by 20 nm. The apparatus is integrated into the capsid and not applied atop the icosahedral lattice. Prior to DNA release, the arms of the star disengage from the virion and it opens by folding back five adjacent triangular faces. A membrane sac containing the DNA emerges from the capsid in preparation for fusion with a membrane of the host cell. Also observed from disrupted virions were masses of distinctive fibers of diameter about 1 nm, and having a 7-nm periodicity. These are probably contained within the capsid along with the DNA bearing sac. The fibers were occasionally observed associated with toroidal protein clusters interpreted as processive enzymes modifying the fibers.

  5. Actuation of atomic force microscopy microcantilevers using contact acoustic nonlinearities

    SciTech Connect (OSTI)

    Torello, D.; Degertekin, F. Levent

    2013-11-15

    A new method of actuating atomic force microscopy (AFM) cantilevers is proposed in which a high frequency (>5 MHz) wave modulated by a lower frequency (∼300 kHz) wave passes through a contact acoustic nonlinearity at the contact interface between the actuator and the cantilever chip. The nonlinearity converts the high frequency, modulated signal to a low frequency drive signal suitable for actuation of tapping-mode AFM probes. The higher harmonic content of this signal is filtered out mechanically by the cantilever transfer function, providing for clean output. A custom probe holder was designed and constructed using rapid prototyping technologies and off-the-shelf components and was interfaced with an Asylum Research MFP-3D AFM, which was then used to evaluate the performance characteristics with respect to standard hardware and linear actuation techniques. Using a carrier frequency of 14.19 MHz, it was observed that the cantilever output was cleaner with this actuation technique and added no significant noise to the system. This setup, without any optimization, was determined to have an actuation bandwidth on the order of 10 MHz, suitable for high speed imaging applications. Using this method, an image was taken that demonstrates the viability of the technique and is compared favorably to images taken with a standard AFM setup.

  6. Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D...

    Office of Scientific and Technical Information (OSTI)

    Materials This project focused on the development of single-pass multifrequency atomic ... Country of Publication: United States Language: English Subject: 77 NANOSCIENCE AND ...

  7. Atomic Force Microscopy Studies of Lipophosphoglycan (LPG) Molecules in Lipid Bilayers

    SciTech Connect (OSTI)

    LAST, JULIE A.; HUBER, TINA; SASAKI, DARRYL Y.; SALVATORE, BRIAN; TURCO, SALVATORE J.

    2003-03-01

    Lipophosphoglycan (LPG) is a lypopolysaccharide found on the surface of the parasite Leishmania donovani that is thought to play an essential role in the infection of humans with leishamniasis. LPG acts as an adhesion point for the parasite to the gut of the sand fly, whose bite is responsible for transmitting the disease. In addition, LPG acts to inhibit protein kinase C (PKC) in the human macrophage, possibly by structural changes in the membrane. The Ca{sup 2+} ion is believed to play a role in the infection cycle, acting both as a crosslinker between LPG molecules and by playing a part in modulating PKC activity. To gain insight into the structure of LPG within a supported lipid membrane and into the structural changes that occur due to Ca{sup 2+} ions, we have employed the atomic force microscope (AFM). We have observed that the LPG molecules inhibit bilayer fusion, resulting in bilayer islands on the mica surface. One experiment suggests that the LPG molecules are parallel to the mica surface and that the structure of the LPG changes upon addition of Ca{sup 2+}, with an increase in the height of the LPG molecules from the bilayer surface and an almost complete coverage of LPG on the bilayer island.

  8. Mapping power-law rheology of living cells using multi-frequency force modulation atomic force microscopy

    SciTech Connect (OSTI)

    Takahashi, Ryosuke; Okajima, Takaharu

    2015-10-26

    We present multi-frequency force modulation atomic force microscopy (AFM) for mapping the complex shear modulus G* of living cells as a function of frequency over the range of 50–500 Hz in the same measurement time as the single-frequency force modulation measurement. The AFM technique enables us to reconstruct image maps of rheological parameters, which exhibit a frequency-dependent power-law behavior with respect to G{sup *}. These quantitative rheological measurements reveal a large spatial variation in G* in this frequency range for single cells. Moreover, we find that the reconstructed images of the power-law rheological parameters are much different from those obtained in force-curve or single-frequency force modulation measurements. This indicates that the former provide information about intracellular mechanical structures of the cells that are usually not resolved with the conventional force measurement methods.

  9. High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments

    SciTech Connect (OSTI)

    Balantekin, M.; Sat?r, S.; Torello, D.; De?ertekin, F. L.

    2014-12-15

    We present the proof-of-principle experiments of a high-speed actuation method to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.

  10. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2010-07-13

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  11. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2009-11-10

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of impaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  12. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2007-12-11

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  13. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2010-06-29

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  14. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2009-10-27

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  15. Photo-thermal quartz tuning fork excitation for dynamic mode atomic force microscope

    SciTech Connect (OSTI)

    Bontempi, Alexia; Teyssieux, Damien; Thiery, Laurent; Hermelin, Damien; Vairac, Pascal; Friedt, Jean-Michel

    2014-10-13

    A photo-thermal excitation of a Quartz Tuning Fork (QTF) for topographic studies is introduced. The non-invasive photo-thermal excitation presents practical advantages compared to QTF mechanical and electrical excitations, including the absence of the anti-resonance and its associated phase rotation. Comparison between our theoretical model and experiments validate that the optical transduction mechanism is a photo-thermal rather than photo-thermoacoustic phenomenon. Topographic maps in the context of near-field microscopy distance control have been achieved to demonstrate the performance of the system.

  16. Inter-atomic force constants of BaF{sub 2} by diffuse neutron scattering measurement

    SciTech Connect (OSTI)

    Sakuma, Takashi Makhsun,; Sakai, Ryutaro; Xianglian; Takahashi, Haruyuki; Basar, Khairul; Igawa, Naoki; Danilkin, Sergey A.

    2015-04-16

    Diffuse neutron scattering measurement on BaF{sub 2} crystals was performed at 10?K and 295?K. Oscillatory form in the diffuse scattering intensity of BaF{sub 2} was observed at 295?K. The correlation effects among thermal displacements of F-F atoms were obtained from the analysis of oscillatory diffuse scattering intensity. The force constants among neighboring atoms in BaF{sub 2} were determined and compared to those in ionic crystals and semiconductors.

  17. High-speed adaptive contact-mode atomic force microscopy imaging with near-minimum-force

    SciTech Connect (OSTI)

    Ren, Juan; Zou, Qingze

    2014-07-15

    In this paper, an adaptive contact-mode imaging approach is proposed to replace the traditional contact-mode imaging by addressing the major concerns in both the speed and the force exerted to the sample. The speed of the traditional contact-mode imaging is largely limited by the need to maintain precision tracking of the sample topography over the entire imaged sample surface, while large image distortion and excessive probe-sample interaction force occur during high-speed imaging. In this work, first, the image distortion caused by the topography tracking error is accounted for in the topography quantification. Second, the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next-line topography is integrated to the topography feeedback loop to enhance the sample topography tracking. The proposed approach is demonstrated and evaluated through imaging a calibration sample of square pitches at both high speeds (e.g., scan rate of 75 Hz and 130 Hz) and large sizes (e.g., scan size of 30 ?m and 80??m). The experimental results show that compared to the traditional constant-force contact-mode imaging, the imaging speed can be increased by over 30 folds (with the scanning speed at 13 mm/s), and the probe-sample interaction force can be reduced by more than 15% while maintaining the same image quality.

  18. Contribution to crystallographic slip assessment by means of topographic measurements achieved with atomic force microscopy

    SciTech Connect (OSTI)

    Kahloun, C.; Badji, R.; Bacroix, B.; Bouabdallah, M.

    2010-09-15

    In this paper, atomic force microscopy (AFM) is used to quantitatively characterize the plastic glide occurring during tensile deformation of a duplex 2205 stainless steel sample. We demonstrate that an appropriate treatment of the topographic image issued from AFM measurements allows precise and quantitative information about the characteristics of plastic deformation and especially the amount of crystallographic slip.

  19. Topography and Mechanical Property Mapping of International Simple Glass Surfaces with Atomic Force Microscopy

    SciTech Connect (OSTI)

    Pierce, Eric M

    2014-01-01

    Quantitative Nanomechanical Peak Force (PF-QNM) TappingModeTM atomic force microscopy measurements are presented for the first time on polished glass surfaces. The PF-QNM technique allows for topography and mechanical property information to be measured simultaneously at each pixel. Results for the international simple glass which represents a simplified version of SON68 glass suggests an average Young s modulus of 78.8 15.1 GPa is within the experimental error of the modulus measured for SON68 glass (83.6 2 GPa) with conventional approaches. Application of the PF-QNM technique will be extended to in situ glass corrosion experiments with the goal of gaining atomic-scale insights into altered layer development by exploiting the mechanical property differences that exist between silica gel (e.g., altered layer) and pristine glass surface.

  20. Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

    SciTech Connect (OSTI)

    Ramos, Jorge R.

    2014-07-28

    The acquisition of high resolution images in atomic force microscopy (AFM) is correlated to the cantilever's tip shape, size, and imaging conditions. In this work, relative tip wear is quantified based on the evolution of a direct experimental observable in amplitude modulation atomic force microscopy, i.e., the critical amplitude. We further show that the scanning parameters required to guarantee a maximum compressive stress that is lower than the yield/fracture stress of the tip can be estimated via experimental observables. In both counts, the optimized parameters to acquire AFM images while preserving the tip are discussed. The results are validated experimentally by employing IgG antibodies as a model system.

  1. A novel self-sensing technique for tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Ruppert, Michael G.; Moheimani, S. O. Reza

    2013-12-15

    This work proposes a novel self-sensing tapping-mode atomic force microscopy operation utilizing charge measurement. A microcantilever coated with a single piezoelectric layer is simultaneously used for actuation and deflection sensing. The cantilever can be batch fabricated with existing micro electro mechanical system processes. The setup enables the omission of the optical beam deflection technique which is commonly used to measure the cantilever oscillation amplitude. Due to the high amount of capacitive feedthrough in the measured charge signal, a feedforward control technique is employed to increase the dynamic range from less than 1 dB to approximately 35 dB. Experiments show that the conditioned charge signal achieves excellent signal-to-noise ratio and can therefore be used as a feedback signal for atomic force microscopy imaging.

  2. Liquid contact resonance atomic force microscopy via experimental reconstruction of the hydrodynamic function

    SciTech Connect (OSTI)

    Tung, Ryan C. Killgore, Jason P.; Hurley, Donna C.

    2014-06-14

    We present a method to correct for surface-coupled inertial and viscous fluid loading forces in contact resonance (CR) atomic force microscopy (AFM) experiments performed in liquid. Based on analytical hydrodynamic theory, the method relies on experimental measurements of the AFM cantilever's free resonance peaks near the sample surface. The free resonance frequencies and quality factors in both air and liquid allow reconstruction of a continuous hydrodynamic function that can be used to adjust the CR data in liquid. Validation experiments utilizing thermally excited free and in-contact spectra were performed to assess the accuracy of our approach. Results show that the method recovers the air frequency values within approximately 6%. Knowledge of fluid loading forces allows current CR analysis techniques formulated for use in air and vacuum environments to be applied to liquid environments. Our technique greatly extends the range of measurement environments available to CR-AFM.

  3. Nanosecond switching in GeSe phase change memory films by atomic force microscopy

    SciTech Connect (OSTI)

    Bosse, James L.; Huey, Bryan D.; Grishin, Ilya; Kolosov, Oleg V.; Gyu Choi, Yong; Cheong, Byung-ki; Lee, Suyoun

    2014-02-03

    Nanosecond scale threshold switching is investigated with conducting atomic force microscopy (AFM) for an amorphous GeSe film. Switched bits exhibit 2–3 orders of magnitude variations in conductivity, as demonstrated in phase change based memory devices. Through the nm-scale AFM probe, this crystallization was achieved with pulse durations of as low as 15 ns, the fastest reported with scanning probe based methods. Conductance AFM imaging of the switched bits further reveals correlations between the switched volume, pulse amplitude, and pulse duration. The influence of film heterogeneities on switching is also directly detected, which is of tremendous importance for optimal device performance.

  4. Conductive atomic force microscopy study of local electronic transport in ZnTe thin films

    SciTech Connect (OSTI)

    Kshirsagar, Sachin D.; Krishna, M. Ghanashyam; Tewari, Surya P.

    2013-02-05

    ZnTe thin films obtained by the electron beam evaporation technique were subjected to thermal annealing at 500 Degree-Sign C for 2 hours. The as deposited films were amorphous but transformed to the crystalline state under influence of the thermal treatment. There is increase in optical absorption due to the heat treatment caused by increase in free carrier concentration. Conductive atomic force microscopy shows the presence of electronic inhomogeneities in the films. This is attributed to local compositional variations in the films. I-V analysis in these systems indicates formation of Schottky junction at the metal semiconductor (M-S) interface.

  5. Contact resonance atomic force microscopy imaging in air and water using photothermal excitation

    SciTech Connect (OSTI)

    Kocun, Marta; Labuda, Aleksander; Gannepalli, Anil; Proksch, Roger

    2015-08-15

    Contact Resonance Force Microscopy (CR-FM) is a leading atomic force microscopy technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been limited to imaging in air, since the “forest of peaks” frequency response associated with acoustic excitation methods effectively masks the true cantilever resonance. Using photothermal excitation results in clean contact, resonance spectra that closely match the ideal frequency response of the cantilever, allowing unambiguous and simple resonance frequency and quality factor measurements in air and liquids alike. This extends the capabilities of CR-FM to biologically relevant and other soft samples in liquid environments. We demonstrate CR-FM in air and water on both stiff silicon/titanium samples and softer polystyrene-polyethylene-polypropylene polymer samples with the quantitative moduli having very good agreement between expected and measured values.

  6. Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Loganathan, Muthukumaran; Bristow, Douglas A.

    2014-04-15

    This paper presents a method and cantilever design for improving the mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method uses two harmonics in the drive signal to generate a bi-harmonic tapping trajectory. Mathematical analysis demonstrates that the wide-valley bi-harmonic tapping trajectory is as much as 70% more sensitive to changes in the sample topography than the standard single-harmonic trajectory typically used. Although standard AFM cantilevers can be driven in the bi-harmonic tapping trajectory, they require large forcing at the second harmonic. A design is presented for a bi-harmonic cantilever that has a second resonant mode at twice its first resonant mode, thereby capable of generating bi-harmonic trajectories with small forcing signals. Bi-harmonic cantilevers are fabricated by milling a small cantilever on the interior of a standard cantilever probe using a focused ion beam. Bi-harmonic drive signals are derived for standard cantilevers and bi-harmonic cantilevers. Experimental results demonstrate better than 30% improvement in measurement sensitivity using the bi-harmonic cantilever. Images obtained through bi-harmonic tapping exhibit improved sharpness and surface tracking, especially at high scan speeds and low force fields.

  7. Design and optimization of a harmonic probe with step cross section in multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Cai, Jiandong; Zhang, Li; Wang, Michael Yu

    2015-12-15

    In multifrequency atomic force microscopy (AFM), probe’s characteristic of assigning resonance frequencies to integer harmonics results in a remarkable improvement of detection sensitivity at specific harmonic components. The selection criterion of harmonic order is based on its amplitude’s sensitivity on material properties, e.g., elasticity. Previous studies on designing harmonic probe are unable to provide a large design capability along with maintaining the structural integrity. Herein, we propose a harmonic probe with step cross section, in which it has variable width in top and bottom steps, while the middle step in cross section is kept constant. Higher order resonance frequencies are tailored to be integer times of fundamental resonance frequency. The probe design is implemented within a structural optimization framework. The optimally designed probe is micromachined using focused ion beam milling technique, and then measured with an AFM. The measurement results agree well with our resonance frequency assignment requirement.

  8. Investigation of leakage current paths in n-GaN by conductive atomic force microscopy

    SciTech Connect (OSTI)

    Kim, Bumho; Park, Yongjo E-mail: eyoon@snu.ac.kr; Moon, Daeyoung; Nanishi, Yasushi; Joo, Kisu; Department of Nano Science and Technology, Graduate School of Convergence Science and Technology, Seoul National University, Suwon 443-270 ; Oh, Sewoung; Lee, Young Kuk; Yoon, Euijoon E-mail: eyoon@snu.ac.kr; WCU Hybrid Materials Program, Department of Materials Science and Engineering, Seoul National University, Seoul 151-742; Department of Nano Science and Technology, Graduate School of Convergence Science and Technology, Seoul National University, Suwon 443-270; Department of Materials Science and Engineering, Seoul National University, Seoul 151-742

    2014-03-10

    We have investigated electrical characteristics of leakage current paths in n-GaN layer grown by metal-organic chemical vapor deposition with conductive-atomic force microscopy (C-AFM). The C-AFM mapping shows two kinds of leakage current paths existing in the n-GaN layer: open-core dislocation and pure screw dislocation. From the localized I-V curves measured by C-AFM, we confirmed that the open-core screw dislocation shows more significant leakage current. We explained these results in terms of a modified Schottky band model based on donor states formed by oxygen segregation at the (10−10) sidewall of the open-core screw dislocation.

  9. ATOMIC FORCE LITHOGRAPHY OF NANO MICROFLUIDIC CHANNELS FOR VERIFICATION AND MONITORING IN AQUEOUS SOLUTIONS

    SciTech Connect (OSTI)

    Torres, R.; Mendez-Torres, A.; Lam, P.

    2011-06-09

    The growing interest in the physics of fluidic flow in nanoscale channels, as well as the possibility for high sensitive detection of ions and single molecules is driving the development of nanofluidic channels. The enrichment of charged analytes due to electric field-controlled flow and surface charge/dipole interactions along the channel can lead to enhancement of sensitivity and limits-of-detection in sensor instruments. Nuclear material processing, waste remediation, and nuclear non-proliferation applications can greatly benefit from this capability. Atomic force microscopy (AFM) provides a low-cost alternative for the machining of disposable nanochannels. The small AFM tip diameter (< 10 nm) can provide for features at scales restricted in conventional optical and electron-beam lithography. This work presents preliminary results on the fabrication of nano/microfluidic channels on polymer films deposited on quartz substrates by AFM lithography.

  10. ATOMIC FORCE LITHOGRAPHY OF NANO/MICROFLUIDIC CHANNELS FOR VERIFICATION AND MONITORING OF AQUEOUS SOLUTIONS

    SciTech Connect (OSTI)

    Mendez-Torres, A.; Torres, R.; Lam, P.

    2011-07-15

    The growing interest in the physics of fluidic flow in nanoscale channels, as well as the possibility for high sensitive detection of ions and single molecules is driving the development of nanofluidic channels. The enrichment of charged analytes due to electric field-controlled flow and surface charge/dipole interactions along the channel can lead to enhancement of sensitivity and limits-of-detection in sensor instruments. Nuclear material processing, waste remediation, and nuclear non-proliferation applications can greatly benefit from this capability. Atomic force microscopy (AFM) provides a low-cost alternative for the machining of disposable nanochannels. The small AFM tip diameter (< 10 nm) can provide for features at scales restricted in conventional optical and electron-beam lithography. This work presents preliminary results on the fabrication of nano/microfluidic channels on polymer films deposited on quartz substrates by AFM lithography.

  11. A serial-kinematic nanopositioner for high-speed atomic force microscopy

    SciTech Connect (OSTI)

    Wadikhaye, Sachin P. Yong, Yuen Kuan; Reza Moheimani, S. O.

    2014-10-15

    A flexure-guided serial-kinematic XYZ nanopositioner for high-speed Atomic Force Microscopy is presented in this paper. Two aspects influencing the performance of serial-kinematic nanopositioners are studied in this work. First, mass reduction by using tapered flexures is proposed to increased the natural frequency of the nanopositioner. 25% increase in the natural frequency is achieved due to reduced mass with tapered flexures. Second, a study of possible sensor positioning in a serial-kinematic nanopositioner is presented. An arrangement of sensors for exact estimation of cross-coupling is incorporated in the proposed design. A feedforward control strategy based on phaser approach is presented to mitigate the dynamics and nonlinearity in the system. Limitations in design approach and control strategy are discussed in the Conclusion.

  12. Atomic-force microscopy and photoluminescence of nanostructured CdTe

    SciTech Connect (OSTI)

    Babentsov, V.; Sizov, F.; Franc, J.; Luchenko, A.; Svezhentsova, E. Tsybrii, Z.

    2013-09-15

    Low-dimensional CdTe nanorods with a diameter of 10-30 nm and a high aspect ratio that reaches 100 are studied. The nanorods are grown by the physical vapor transport method with the use of Bi precipitates on the substrates. In addition, thin films of closely packed CdTe nanorods with the transverse dimensions {approx}(100-200) nm are grown. Atomic-force microscopy shows that the cross sections of all of the nanorods were hexagonally shaped. By photoluminescence measurements, the inference about the wurtzite structure of CdTe is supported, and the structural quality, electron-phonon coupling, and defects are analyzed. On the basis of recent ab initio calculations, the nature of defects responsible for the formation of deep levels in the CdTe layers and bulk crystals are analyzed.

  13. Antimicrobial properties of analgesic kyotorphin peptides unraveled through atomic force microscopy

    SciTech Connect (OSTI)

    Ribeiro, Marta M.B.; Franquelim, Henri G.; Torcato, Ines M.; Ramu, Vasanthakumar G.; Heras, Montserrat; Bardaji, Eduard R.; Castanho, Miguel A.R.B.

    2012-04-13

    Highlights: Black-Right-Pointing-Pointer New kyotorphin derivatives have antimicrobial properties against S. aureus. Black-Right-Pointing-Pointer Atomic force microscopy show membrane disturbing effects of KTP-NH{sub 2} and IbKTP-NH{sub 2}. Black-Right-Pointing-Pointer None of the KTP derivatives are hemolytic. Black-Right-Pointing-Pointer The minimal peptidic sequence with antimicrobial activity is Tyr-Arg, if amidated. -- Abstract: Antimicrobial peptides (AMPs) are promising candidates as alternatives to conventional antibiotics for the treatment of resistant pathogens. In the last decades, new AMPs have been found from the cleavage of intact proteins with no antibacterial activity themselves. Bovine hemoglobin hydrolysis, for instance, results in AMPs and the minimal antimicrobial peptide sequence was defined as Tyr-Arg plus a positively charged amino acid residue. The Tyr-Arg dipeptide alone, known as kyotorphin (KTP), is an endogenous analgesic neuropeptide but has no antimicrobial activity itself. In previous studies new KTP derivatives combining C-terminal amidation and Ibuprofen (Ib) - KTP-NH{sub 2}, IbKTP, IbKTP-NH{sub 2} - were designed in order to improve KTP brain targeting. Those modifications succeeded in enhancing peptide-cell membrane affinity towards fluid anionic lipids and higher analgesic activity after systemic injection resulted therefrom. Here, we investigated if this affinity for anionic lipid membranes also translates into antimicrobial activity because bacteria have anionic membranes. Atomic force microscopy revealed that KTP derivatives perturbed Staphylococcus aureus membrane structure by inducing membrane blebbing, disruption and lysis. In addition, these peptides bind to red blood cells but are non-hemolytic. From the KTP derivatives tested, amidated KTP proves to be the most active antibacterial agent. The combination of analgesia and antibacterial activities with absence of toxicity is highly appealing from the clinical point of view

  14. Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D Mapping of Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials

    SciTech Connect (OSTI)

    Solares, Santiago D.

    2015-09-18

    This project focused on the development of single-pass multifrequency atomic force microscopy methods for the rapid multi-function nanoscale characterization of energy-relevant materials.

  15. A variable-width harmonic probe for multifrequency atomic force microscopy

    SciTech Connect (OSTI)

    Cai, Jiandong; Zhang, Li; Xia, Qi E-mail: michael.wang@nus.edu.sg; Luo, Yangjun; Wang, Michael Yu E-mail: michael.wang@nus.edu.sg

    2015-02-16

    In multifrequency atomic force microscopy (AFM) to simultaneously measure topography and material properties of specimens, it is highly desirable that the higher order resonance frequencies of the cantilever probe are assigned to be integer harmonics of the excitation frequency. The harmonic resonances are essential for significant enhancement of the probe's response at the specified harmonic frequencies. In this letter, a structural optimization technique is employed to design cantilever probes so that the ratios between one or more higher order resonance frequencies and the fundamental natural frequency are ensured to be equal to specified integers and, in the meantime, that the fundamental natural frequency is maximized. Width profile of the cantilever probe is the design variable in optimization. Thereafter, the probes were prepared by modifying a commercial probe through the focused ion beam (FIB) milling. The resonance frequencies of the FIB fabricated probes were measured with an AFM. Results of the measurement show that the optimal design of probe is as effective as design prediction.

  16. Imaging and quantitative data acquisition of biological cell walls with Atomic Force Microscopy and Scanning Acoustic Microscopy

    SciTech Connect (OSTI)

    Tittmann, B. R.; Xi, X.

    2014-09-01

    This chapter demonstrates the feasibility of Atomic Force Microscopy (AFM) and High Frequency Scanning Acoustic Microscopy (HF-SAM) as tools to characterize biological tissues. Both the AFM and the SAM have shown to provide imaging (with different resolution) and quantitative elasticity measuring abilities. Plant cell walls with minimal disturbance and under conditions of their native state have been examined with these two kinds of microscopy. After descriptions of both the SAM and AFM, their special features and the typical sample preparation is discussed. The sample preparation is focused here on epidermal peels of onion scales and celery epidermis cells which were sectioned for the AFM to visualize the inner surface (closest to the plasma membrane) of the outer epidermal wall. The nm-wide cellulose microfibrils orientation and multilayer structure were clearly observed. The microfibril orientation and alignment tend to be more organized in older scales compared with younger scales. The onion epidermis cell wall was also used as a test analog to study cell wall elasticity by the AFM nanoindentation and the SAM V(z) feature. The novelty in this work was to demonstrate the capability of these two techniques to analyze isolated, single layered plant cell walls in their natural state. AFM nanoindentation was also used to probe the effects of Ethylenediaminetetraacetic acid (EDTA), and calcium ion treatment to modify pectin networks in cell walls. The results suggest a significant modulus increase in the calcium ion treatment and a slight decrease in EDTA treatment. To complement the AFM measurements, the HF-SAM was used to obtain the V(z) signatures of the onion epidermis. These measurements were focused on documenting the effect of pectinase enzyme treatment. The results indicate a significant change in the V(z) signature curves with time into the enzyme treatment. Thus AFM and HF-SAM open the door to a systematic nondestructive structure and mechanical property

  17. Electron Microscope Facility

    ScienceCinema (OSTI)

    None

    2010-01-08

    Brookhaven Lab is home to one of only a few Scanning Transmision Electron Microscope (STEM) machines in the world and one of the few that can image single heavy atoms.

  18. Mapping of Proteomic Composition on the Surfaces of Bacillus spores by Atomic Force Microscopy-based Immunolabeling

    SciTech Connect (OSTI)

    Plomp, M; Malkin, A J

    2008-06-02

    Atomic force microscopy provides a unique capability to image high-resolution architecture and structural dynamics of pathogens (e.g. viruses, bacteria and bacterial spores) at near molecular resolution in native conditions. Further development of atomic force microscopy in order to enable the correlation of pathogen protein surface structures with specific gene products is essential to understand the mechanisms of the pathogen life cycle. We have applied an AFM-based immunolabeling technique for the proteomic mapping of macromolecular structures through the visualization of the binding of antibodies, conjugated with nanogold particles, to specific epitopes on Bacillus spore surfaces. This information is generated while simultaneously acquiring the surface morphology of the pathogen. The immunospecificity of this labeling method was established through the utilization of specific polyclonal and monoclonal antibodies that target spore coat and exosporium epitopes of Bacillus atrophaeus and Bacillus anthracis spores.

  19. A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Solares, Santiago D.

    2015-11-26

    This study introduces a quasi-3-dimensional (Q3D) viscoelastic model and software tool for use in atomic force microscopy (AFM) simulations. The model is based on a 2-dimensional array of standard linear solid (SLS) model elements. The well-known 1-dimensional SLS model is a textbook example in viscoelastic theory but is relatively new in AFM simulation. It is the simplest model that offers a qualitatively correct description of the most fundamental viscoelastic behaviors, namely stress relaxation and creep. However, this simple model does not reflect the correct curvature in the repulsive portion of the force curve, so its application in the quantitative interpretationmore » of AFM experiments is relatively limited. In the proposed Q3D model the use of an array of SLS elements leads to force curves that have the typical upward curvature in the repulsive region, while still offering a very low computational cost. Furthermore, the use of a multidimensional model allows for the study of AFM tips having non-ideal geometries, which can be extremely useful in practice. Examples of typical force curves are provided for single- and multifrequency tappingmode imaging, for both of which the force curves exhibit the expected features. Lastly, a software tool to simulate amplitude and phase spectroscopy curves is provided, which can be easily modified to implement other controls schemes in order to aid in the interpretation of AFM experiments.« less

  20. A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

    SciTech Connect (OSTI)

    Solares, Santiago D.

    2015-11-26

    This study introduces a quasi-3-dimensional (Q3D) viscoelastic model and software tool for use in atomic force microscopy (AFM) simulations. The model is based on a 2-dimensional array of standard linear solid (SLS) model elements. The well-known 1-dimensional SLS model is a textbook example in viscoelastic theory but is relatively new in AFM simulation. It is the simplest model that offers a qualitatively correct description of the most fundamental viscoelastic behaviors, namely stress relaxation and creep. However, this simple model does not reflect the correct curvature in the repulsive portion of the force curve, so its application in the quantitative interpretation of AFM experiments is relatively limited. In the proposed Q3D model the use of an array of SLS elements leads to force curves that have the typical upward curvature in the repulsive region, while still offering a very low computational cost. Furthermore, the use of a multidimensional model allows for the study of AFM tips having non-ideal geometries, which can be extremely useful in practice. Examples of typical force curves are provided for single- and multifrequency tappingmode imaging, for both of which the force curves exhibit the expected features. Lastly, a software tool to simulate amplitude and phase spectroscopy curves is provided, which can be easily modified to implement other controls schemes in order to aid in the interpretation of AFM experiments.

  1. Local elastic modulus of RF sputtered HfO{sub 2} thin film by atomic force acoustic microscopy

    SciTech Connect (OSTI)

    Jena, S. Tokas, R. B. Sarkar, P. Thakur, S.; Sahoo, N. K.; Misal, J. S.; Rao, K. D.

    2014-04-24

    Atomic force acoustic microscopy (AFAM) is a useful nondestructive technique for measurement of local elastic modulus of materials at nano-scale spatial resolution by measuring the contact resonance spectra for higher order modes of the AFM cantilever. The elastic modulus of RF sputtered HfO{sub 2} thin film has been measured quantitatively, using reference approach in which measurements are performed on the test and reference samples. Using AFAM, the measured elastic modulus of the HfO{sub 2} thin film is 223±27 GPa, which is in agreement with the literature value of 220±40 GPa for atomic layer deposited HfO{sub 2} thin film using nanoindentation technique.

  2. Probing the elastic response of microalga Scenedesmus dimorphus in dry and aqueous environments through atomic force microscopy

    SciTech Connect (OSTI)

    Warren, K. M.; Mpagazehe, J. N.; Higgs, C. F. E-mail: higgs@andrew.cmu.edu; LeDuc, P. R. E-mail: higgs@andrew.cmu.edu

    2014-10-20

    With the re-emergence of microalgae as a replacement feedstock for petroleum-derived oils, researchers are working to understand its chemical and mechanical behavior. In this work, the mechanical properties of microalgae, Scenedesmus dimorphus, were investigated at the subcellular level to determine the elastic response of cells that were in an aqueous and dried state using nano-scale indentation through atomic force microscopy. The elastic modulus of single-celled S. dimorphus cells increased over tenfold from an aqueous state to a dried state, which allows us to better understand the biophysical response of microalgae to stress.

  3. Parameter sensitivity analysis of nonlinear piezoelectric probe in tapping mode atomic force microscopy for measurement improvement

    SciTech Connect (OSTI)

    McCarty, Rachael; Nima Mahmoodi, S.

    2014-02-21

    The equations of motion for a piezoelectric microcantilever are derived for a nonlinear contact force. The analytical expressions for natural frequencies and mode shapes are obtained. Then, the method of multiple scales is used to analyze the analytical frequency response of the piezoelectric probe. The effects of nonlinear excitation force on the microcantilever beam's frequency and amplitude are analytically studied. The results show a frequency shift in the response resulting from the force nonlinearities. This frequency shift during contact mode is an important consideration in the modeling of AFM mechanics for generation of more accurate imaging. Also, a sensitivity analysis of the system parameters on the nonlinearity effect is performed. The results of a sensitivity analysis show that it is possible to choose parameters such that the frequency shift minimizes. Certain parameters such as tip radius, microcantilever beam dimensions, and modulus of elasticity have more influence on the nonlinearity of the system than other parameters. By changing only three parameters—tip radius, thickness, and modulus of elasticity of the microbeam—a more than 70% reduction in nonlinearity effect was achieved.

  4. Imaging and measuring the biophysical properties of Fc gamma receptors on single macrophages using atomic force microscopy

    SciTech Connect (OSTI)

    Li, Mi; University of Chinese Academy of Sciences, Beijing 100049 ; Liu, Lianqing; Xi, Ning; Wang, Yuechao; Xiao, Xiubin; Zhang, Weijing

    2013-09-06

    Highlights: Nanoscale cellular ultra-structures of macrophages were observed. The binding affinities of Fc?Rs were measured directly on macrophages. The nanoscale distributions of Fc?Rs were mapped on macrophages. -- Abstract: Fc gamma receptors (Fc?R), widely expressed on effector cells (e.g., NK cells, macrophages), play an important role in clinical cancer immunotherapy. The binding of Fc?Rs to the Fc portions of antibodies that are attached to the target cells can activate the antibody-dependent cell-mediated cytotoxicity (ADCC) killing mechanism which leads to the lysis of target cells. In this work, we used atomic force microscopy (AFM) to observe the cellular ultra-structures and measure the biophysical properties (affinity and distribution) of Fc?Rs on single macrophages in aqueous environments. AFM imaging was used to obtain the topographies of macrophages, revealing the nanoscale cellular fine structures. For molecular interaction recognition, antibody molecules were attached onto AFM tips via a heterobifunctional polyethylene glycol (PEG) crosslinker. With AFM single-molecule force spectroscopy, the binding affinities of Fc?Rs were quantitatively measured on single macrophages. Adhesion force mapping method was used to localize the Fc?Rs, revealing the nanoscale distribution of Fc?Rs on local areas of macrophages. The experimental results can improve our understanding of Fc?Rs on macrophages; the established approach will facilitate further research on physiological activities involved in antibody-based immunotherapy.

  5. Isolating and moving single atoms using silicon nanocrystals

    DOE Patents [OSTI]

    Carroll, Malcolm S.

    2010-09-07

    A method is disclosed for isolating single atoms of an atomic species of interest by locating the atoms within silicon nanocrystals. This can be done by implanting, on the average, a single atom of the atomic species of interest into each nanocrystal, and then measuring an electrical charge distribution on the nanocrystals with scanning capacitance microscopy (SCM) or electrostatic force microscopy (EFM) to identify and select those nanocrystals having exactly one atom of the atomic species of interest therein. The nanocrystals with the single atom of the atomic species of interest therein can be sorted and moved using an atomic force microscope (AFM) tip. The method is useful for forming nanoscale electronic and optical devices including quantum computers and single-photon light sources.

  6. Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging

    SciTech Connect (OSTI)

    Guo, Senli; Santiago, Solares D; Mochalin, Vadym; Neitzel, Ioannis; Gogotsi, Yury G.; Kalinin, Sergei V; Jesse, Stephen

    2012-01-01

    Force-based scanning probe microscopies have emerged as a mainstay for probing structural and mechanical properties of materials on the nanometer and molecular scales. Despite tremendous progress achieved to date, the cantilever dynamics in single frequency scanning probe microscopies (SPM) is undefined due to having only two output variables. Here we demonstrate on diamond nanoparticles with different functionalization layers that the use of broad band detection by multiple frequency SPM allows complete information on tip-surface interactions in intermittent contact SPM to be acquired. The obtained data allows sub-3nm resolution even in ambient environment. By tuning the strength of tip-surface interaction, the information on surface state can be obtained.

  7. Note: A silicon-on-insulator microelectromechanical systems probe scanner for on-chip atomic force microscopy

    SciTech Connect (OSTI)

    Fowler, Anthony G.; Maroufi, Mohammad; Moheimani, S. O. Reza

    2015-04-15

    A new microelectromechanical systems-based 2-degree-of-freedom (DoF) scanner with an integrated cantilever for on-chip atomic force microscopy (AFM) is presented. The silicon cantilever features a layer of piezoelectric material to facilitate its use for tapping mode AFM and enable simultaneous deflection sensing. Electrostatic actuators and electrothermal sensors are used to accurately position the cantilever within the x-y plane. Experimental testing shows that the cantilever is able to be scanned over a 10 μm × 10 μm window and that the cantilever achieves a peak-to-peak deflection greater than 400 nm when excited at its resonance frequency of approximately 62 kHz.

  8. Microscope collision protection apparatus

    DOE Patents [OSTI]

    DeNure, Charles R.

    2001-10-23

    A microscope collision protection apparatus for a remote control microscope which protects the optical and associated components from damage in the event of an uncontrolled collision with a specimen, regardless of the specimen size or shape. In a preferred embodiment, the apparatus includes a counterbalanced slide for mounting the microscope's optical components. This slide replaces the rigid mounts on conventional upright microscopes with a precision ball bearing slide. As the specimen contacts an optical component, the contacting force will move the slide and the optical components mounted thereon. This movement will protect the optical and associated components from damage as the movement causes a limit switch to be actuated, thereby stopping all motors responsible for the collision.

  9. True atomic-scale imaging of a spinel Li{sub 4}Ti{sub 5}O{sub 12}(111) surface in aqueous solution by frequency-modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kitta, Mitsunori, E-mail: m-kitta@aist.go.jp; Kohyama, Masanori [Research Institute for Ubiquitous Energy Devices, National Institute of Advanced Industrial Science and Technology, 1-8-31 Midorigaoka, Ikeda, Osaka 563-8577 (Japan); Onishi, Hiroshi [Department of Chemistry, Graduate School of Science, Kobe University 1-1 Rokkodai, Nada, Kobe 657-8501 (Japan)

    2014-09-15

    Spinel-type lithium titanium oxide (LTO; Li{sub 4}Ti{sub 5}O{sub 12}) is a negative electrode material for lithium-ion batteries. Revealing the atomic-scale surface structure of LTO in liquid is highly necessary to investigate its surface properties in practical environments. Here, we reveal an atomic-scale image of the LTO(111) surface in LiCl aqueous solution using frequency-modulation atomic force microscopy. Atomically flat terraces and single steps having heights of multiples of 0.5?nm were observed in the aqueous solution. Hexagonal bright spots separated by 0.6?nm were also observed on the flat terrace part, corresponding to the atomistic contrast observed in the ultrahigh vacuum condition, which suggests that the basic atomic structure of the LTO(111) surface is retained without dramatic reconstruction even in the aqueous solution.

  10. Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy

    SciTech Connect (OSTI)

    Kobayashi, Kei; Yamada, Hirofumi; Matsushige, Kazumi

    2011-03-15

    We recently reported the analysis of the frequency noise in the frequency modulation atomic force microscopy (FM-AFM) both in high-Q and low-Q environments [Rev. Sci. Instrum. 80, 043708 (2009)]. We showed in the paper that the oscillator noise, the frequency fluctuation of the oscillator, becomes prominent in the modulation frequency lower than f{sub 0}/2Q, where f{sub 0} and Q are the resonance frequency and Q-factor. The magnitude of the oscillator noise is determined by the slope of the phase versus frequency curve of the cantilever at f{sub 0}. However, in actual FM-AFM in liquids, the phase versus frequency curve may not be always ideal because of the existence of various phase shifting elements (PSEs). For example, the spurious resonance peaks caused by the acoustic excitation and a band-pass filter in the self-oscillation loop increase the slope of the phase versus frequency curve. Due to those PSEs, the effective Q-factor is often increased from the intrinsic Q-factor of the cantilever. In this article, the frequency noise in the FM-AFM system with the PSEs in the self-oscillation loop is analyzed to show that the oscillator noise is reduced by the increase of the effective Q-factor. It is also shown that the oscillation frequency deviates from the resonance frequency due to the increase of the effective Q-factor, thereby causing the reduction in the frequency shift signal with the same factor. Therefore the increase of the effective Q-factor does not affect the signal-to-noise ratio in the frequency shift measurement, but it does affect the quantitativeness of the measured force in the FM-AFM. Furthermore, the reduction of the frequency noise and frequency shift by the increase of the effective Q-factor were confirmed by the experiments.

  11. Topographical and Chemical Imaging of a Phase Separated Polymer Using a Combined Atomic Force Microscopy/Infrared Spectroscopy/Mass Spectrometry Platform

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Tai, Tamin; Karácsony, Orsolya; Bocharova, Vera; Van Berkel, Gary J.; Kertesz, Vilmos

    2016-02-18

    This article describes how the use of a hybrid atomic force microscopy/infrared spectroscopy/mass spectrometry imaging platform was demonstrated for the acquisition and correlation of nanoscale sample surface topography and chemical images based on infrared spectroscopy and mass spectrometry.

  12. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications

    SciTech Connect (OSTI)

    Morawski, Ireneusz; Spiegelberg, Richard; Korte, Stefan; Voigtländer, Bert

    2015-12-15

    A method which allows scanning tunneling microscopy (STM) tip biasing independent of the sample bias during frequency modulated atomic force microscopy (AFM) operation is presented. The AFM sensor is supplied by an electronic circuit combining both a frequency shift signal and a tunneling current signal by means of an inductive coupling. This solution enables a control of the tip potential independent of the sample potential. Individual tip biasing is specifically important in order to implement multi-tip STM/AFM applications. An extensional quartz sensor (needle sensor) with a conductive tip is applied to record simultaneously topography and conductivity of the sample. The high resonance frequency of the needle sensor (1 MHz) allows scanning of a large area of the surface being investigated in a reasonably short time. A recipe for the amplitude calibration which is based only on the frequency shift signal and does not require the tip being in contact is presented. Additionally, we show spectral measurements of the mechanical vibration noise of the scanning system used in the investigations.

  13. Selection of higher eigenmode amplitude based on dissipated power and virial contrast in bimodal atomic force microscopy

    SciTech Connect (OSTI)

    Diaz, Alfredo J.; Eslami, Babak; Lpez-Guerra, Enrique A.; Solares, Santiago D.

    2014-09-14

    This paper explores the effect of the amplitude ratio of the higher to the fundamental eigenmode in bimodal atomic force microscopy (AFM) on the phase contrast and the dissipated power contrast of the higher eigenmode. We explore the optimization of the amplitude ratio in order to maximize the type of contrast that is most relevant to the particular study. Specifically, we show that the trends in the contrast range behave differently for different quantities, especially the dissipated power and the phase, with the former being more meaningful than the latter (a similar analysis can be carried out using the virial, for which we also provide a brief example). Our work is based on numerical simulations using two different conservative-dissipative tip-sample models, including the standard linear solid and the combination of a dissipation coefficient with a conservative model, as well as experimental images of thin film Nafion{sup } proton exchange polymers. We focus on the original bimodal AFM method, where the higher eigenmode is driven with constant amplitude and frequency (i.e., in open loop).

  14. Direct observation of electron emission from the grain boundaries of chemical vapour deposition diamond films by tunneling atomic force microscopy

    SciTech Connect (OSTI)

    Chatterjee, Vijay; Harniman, Robert; May, Paul W.; Barhai, P. K.

    2014-04-28

    The emission of electrons from diamond in vacuum occurs readily as a result of the negative electron affinity of the hydrogenated surface due to features with nanoscale dimensions, which can concentrate electric fields high enough to induce electron emission from them. Electrons can be emitted as a result of an applied electric field (field emission) with possible uses in displays or cold-cathode devices. Alternatively, electrons can be emitted simply by heating the diamond in vacuum to temperatures as low as 350?C (thermionic emission), and this may find applications in solar energy generation or energy harvesting devices. Electron emission studies usually use doped polycrystalline diamond films deposited onto Si or metallic substrates by chemical vapor deposition, and these films have a rough, faceted morphology on the micron or nanometer scale. Electron emission is often improved by patterning the diamond surface into sharp points or needles, the idea being that the field lines concentrate at the points lowering the barrier for electron emission. However, there is little direct evidence that electrons are emitted from these sharp tips. The few reports in the literature that have studied the emission sites suggested that emission came from the grain boundaries and not the protruding regions. We now present direct observation of the emission sites over a large area of polycrystalline diamond using tunneling atomic force microscopy. We confirm that the emission current comes mostly from the grain boundaries, which is consistent with a model for emission in which the non-diamond phase is the source of electrons with a threshold that is determined by the surrounding hydrogenated diamond surface.

  15. Nanometer-scale electrochemical patterning of LiMn2O4 surfaces by an atomic force microscope operating in air

    SciTech Connect (OSTI)

    Kostecki, Robert; Bonhomme, Frederic; Servant, Laurent; Argoul, Francoise; McLarnon, Frank

    2001-06-22

    Electrochemical nanometer-scale patterning of the surface of a conducting lithium manganese oxide (LiMn{sub 2}O{sub 4}) by scanning probe microscopy (SPM) was studied. The ability to produce nanometer-size patterns of chemically modified oxide or nanometer-sized alterations of the oxide morphology is demonstrated and discussed with reference to possible mechanisms. It is demonstrated that unlike the SPM-based surface oxidation of metals and semiconductors, the LiMn{sub 2}O{sub 4} surface is altered via electrochemically generated species. We show that a localized surface chemical change can be confined to a depth which depends on the oxide-tip voltage difference and ambient humidity. In situ Raman microscopy measurements of localized electrochemical reaction products suggest complex mechanisms of processes induced at the LiMn{sub 2}O{sub 4} surface, such as delithiation through Li-proton exchange and disproportionation of LiMn{sub 2}O{sub 4} to MnO{sub 2} and soluble Mn{sup 2+} species.

  16. Long-lived frequency shifts observed in a magnetic resonance force microscope experiment following microwave irradiation of a nitroxide spin probe

    SciTech Connect (OSTI)

    Chen, Lei; Longenecker, Jonilyn G.; Moore, Eric W.; Marohn, John A.

    2013-04-01

    We introduce a spin-modulation protocol for force-gradient detection of magnetic resonance that enables the real-time readout of longitudinal magnetization in an electron spin resonance experiment involving fast-relaxing spins. We applied this method to observe a prompt change in longitudinal magnetization following the microwave irradiation of a nitroxide-doped perdeuterated polystyrene film having an electron spin-lattice relaxation time of T{sub 1}{approx}1ms. The protocol allowed us to discover a large, long-lived cantilever frequency shift. Based on its magnitude, lifetime, and field dependence, we tentatively attribute this persistent signal to deuteron spin magnetization created via transfer of polarization from nitroxide spins.

  17. Mechanism of force mode dip-pen nanolithography

    SciTech Connect (OSTI)

    Yang, Haijun E-mail: swguo@sjtu.edu.cn; Xie, Hui; Rong, Weibin; Sun, Lining; Wu, Haixia; Guo, Shouwu E-mail: swguo@sjtu.edu.cn

    2014-05-07

    In this work, the underlying mechanism of the force mode dip-pen nanolithography (FMDPN) is investigated in depth by analyzing force curves, tapping mode deflection signals, and Z-scan voltage variations during the FMDPN. The operation parameters including the relative trigger threshold and surface delay parameters are vital to control the loading force and dwell time for ink deposition during FMDPN. A model is also developed to simulate the interactions between the atomic force microscope tip and soft substrate during FMDPN, and verified by its good performance in fitting our experimental data.

  18. Electric transport through nanometric CoFe{sub 2}O{sub 4} thin films investigated by conducting atomic force microscopy

    SciTech Connect (OSTI)

    Foerster, M.; Gutierrez, D. F.; Rigato, F.; Fontcuberta, J.; Rebled, J. M.; Peiro, F.

    2012-01-01

    A systematic study of electric transport through thin (2-8 nm) CoFe{sub 2}O{sub 4} films deposited on epitaxial SrRuO{sub 3} bottom electrodes was performed by conducting atomic force microscopy (CAFM). Experimental procedures to investigate transport through thin insulating films by CAFM are critically revised, and the potential of CoFe{sub 2}O{sub 4} films for the use as spin-filtering barriers is assessed. It is concluded that, at room-temperature, a non-tunnel channel significantly contributes to the electric transport, thus limiting the spin-filtering efficiency.

  19. A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy

    SciTech Connect (OSTI)

    Mullin, Nic Hobbs, Jamie K.

    2014-11-15

    Calibration of lateral forces and displacements has been a long standing problem in lateral force microscopies. Recently, it was shown by Wagner et al. that the thermal noise spectrum of the first torsional mode may be used to calibrate the deflection sensitivity of the detector. This method is quick, non-destructive and may be performed in situ in air or liquid. Here we make a full quantitative comparison of the lateral inverse optical lever sensitivity obtained by the lateral thermal noise method and the shape independent method developed by Anderson et al. We find that the thermal method provides accurate results for a wide variety of rectangular cantilevers, provided that the geometry of the cantilever is suitable for torsional stiffness calibration by the torsional Sader method, in-plane bending of the cantilever may be eliminated or accounted for and that any scaling of the lateral deflection signal between the measurement of the lateral thermal noise and the measurement of the lateral deflection is eliminated or corrected for. We also demonstrate that the thermal method may be used to characterize the linearity of the detector signal as a function of position, and find a deviation of less than 8% for the instrument used.

  20. Cross-Sectional Conductive Atomic Force Microscopy of CdTe/CdS Solar Cells: Effects of Etching and Back-Contact Processes; Preprint

    SciTech Connect (OSTI)

    Moutinho, H. R.; Dhere, R. G.; Jiang, C.-S.; Gessert, T. A.; Duda, A. M.; Young, M.; Metzger, W. K.; Li, X.; Al-Jassim, M. M.

    2006-05-01

    We investigated the effects of the etching processes using bromine and nitric-phosphoric acid solutions, as well as of Cu, in the bulk electrical conductivity of CdTe/CdS solar cells using conductive atomic force microscopy (C-AFM). Although the etching process can create a conductive layer on the surface of the CdTe, the layer is very shallow. In contrast, the addition of a thin layer of Cu to the surface creates a conductive layer inside the CdTe that is not uniform in depth, is concentrated at grains boundaries, and may short circuit the device if the CdTe is too thin. The etching process facilitates the Cu diffusion and results in thicker conductive layers. The existence of this inhomogeneous conductive layer directly affects the current transport and is probably the reason for needing thick CdTe in these devices.

  1. An improved proximity force approximation for electrostatics

    SciTech Connect (OSTI)

    Fosco, Cesar D.; Instituto Balseiro, Universidad Nacional de Cuyo, R8402AGP Bariloche ; Lombardo, Fernando C.; IFIBA ; Mazzitelli, Francisco D.

    2012-08-15

    A quite straightforward approximation for the electrostatic interaction between two perfectly conducting surfaces suggests itself when the distance between them is much smaller than the characteristic lengths associated with their shapes. Indeed, in the so called 'proximity force approximation' the electrostatic force is evaluated by first dividing each surface into a set of small flat patches, and then adding up the forces due two opposite pairs, the contributions of which are approximated as due to pairs of parallel planes. This approximation has been widely and successfully applied in different contexts, ranging from nuclear physics to Casimir effect calculations. We present here an improvement on this approximation, based on a derivative expansion for the electrostatic energy contained between the surfaces. The results obtained could be useful for discussing the geometric dependence of the electrostatic force, and also as a convenient benchmark for numerical analyses of the tip-sample electrostatic interaction in atomic force microscopes. - Highlights: Black-Right-Pointing-Pointer The proximity force approximation (PFA) has been widely used in different areas. Black-Right-Pointing-Pointer The PFA can be improved using a derivative expansion in the shape of the surfaces. Black-Right-Pointing-Pointer We use the improved PFA to compute electrostatic forces between conductors. Black-Right-Pointing-Pointer The results can be used as an analytic benchmark for numerical calculations in AFM. Black-Right-Pointing-Pointer Insight is provided for people who use the PFA to compute nuclear and Casimir forces.

  2. Note: A rigid piezo motor with large output force and an effective method to reduce sliding friction force

    SciTech Connect (OSTI)

    Guo, Ying; Lu, Qingyou; Hou, Yubin

    2014-05-15

    We present a completely practical TunaDrive piezo motor. It consists of a central piezo stack sandwiched by two arm piezo stacks and two leg piezo stacks, respectively, which is then sandwiched and spring-clamped by a pair of parallel polished sapphire rods. It works by alternatively fast expanding and contracting the arm/leg stacks while slowly expanding/contracting the central stack simultaneously. The key point is that sufficiently fast expanding and contracting a limb stack can make its two sliding friction forces well cancel, resulting in the total sliding friction force is <10% of the total static friction force, which can help increase output force greatly. The piezo motor's high compactness, precision, and output force make it perfect in building a high-quality harsh-condition (vibration resistant) atomic resolution scanning probe microscope.

  3. Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform

    SciTech Connect (OSTI)

    Ovchinnikova, Olga S.; Tai, Tamin; Bocharova, Vera; Okatan, Mahmut Baris; Belianinov, Alex; Kertesz, Vilmos; Jesse, Stephen; Van Berkel, Gary J.

    2015-03-18

    The advancement of a hybrid atomic force microscopy/mass spectrometry imaging platform demonstrating for the first time co-registered topographical, band excitation nanomechanical, and mass spectral imaging of a surface using a single instrument is reported. The mass spectrometry-based chemical imaging component of the system utilized nanothermal analysis probes for pyrolytic surface sampling followed by atmospheric pressure chemical ionization of the gas phase species produced with subsequent mass analysis. We discuss the basic instrumental setup and operation and the multimodal imaging capability and utility are demonstrated using a phase separated polystyrene/poly(2-vinylpyridine) polymer blend thin film. The topography and band excitation images showed that the valley and plateau regions of the thin film surface were comprised primarily of one of the two polymers in the blend with the mass spectral chemical image used to definitively identify the polymers at the different locations. Data point pixel size for the topography (390 nm x 390 nm), band excitation (781 nm x 781 nm), mass spectrometry (690 nm x 500 nm) images was comparable and submicrometer in all three cases, but the data voxel size for each of the three images was dramatically different. The topography image was uniquely a surface measurement, whereas the band excitation image included information from an estimated 10 nm deep into the sample and the mass spectral image from 110-140 nm in depth. Moreover, because of this dramatic sampling depth variance, some differences in the band excitation and mass spectrometry chemical images were observed and were interpreted to indicate the presence of a buried interface in the sample. The spatial resolution of the mass spectral image was estimated to be between 1.5 m 2.6 m, based on the ability to distinguish surface features in that image that were also observed in the other images.

  4. Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ovchinnikova, Olga S.; Tai, Tamin; Bocharova, Vera; Okatan, Mahmut Baris; Belianinov, Alex; Kertesz, Vilmos; Jesse, Stephen; Van Berkel, Gary J.

    2015-03-18

    The advancement of a hybrid atomic force microscopy/mass spectrometry imaging platform demonstrating for the first time co-registered topographical, band excitation nanomechanical, and mass spectral imaging of a surface using a single instrument is reported. The mass spectrometry-based chemical imaging component of the system utilized nanothermal analysis probes for pyrolytic surface sampling followed by atmospheric pressure chemical ionization of the gas phase species produced with subsequent mass analysis. We discuss the basic instrumental setup and operation and the multimodal imaging capability and utility are demonstrated using a phase separated polystyrene/poly(2-vinylpyridine) polymer blend thin film. The topography and band excitation images showedmore » that the valley and plateau regions of the thin film surface were comprised primarily of one of the two polymers in the blend with the mass spectral chemical image used to definitively identify the polymers at the different locations. Data point pixel size for the topography (390 nm x 390 nm), band excitation (781 nm x 781 nm), mass spectrometry (690 nm x 500 nm) images was comparable and submicrometer in all three cases, but the data voxel size for each of the three images was dramatically different. The topography image was uniquely a surface measurement, whereas the band excitation image included information from an estimated 10 nm deep into the sample and the mass spectral image from 110-140 nm in depth. Moreover, because of this dramatic sampling depth variance, some differences in the band excitation and mass spectrometry chemical images were observed and were interpreted to indicate the presence of a buried interface in the sample. The spatial resolution of the mass spectral image was estimated to be between 1.5 m 2.6 m, based on the ability to distinguish surface features in that image that were also observed in the other images.« less

  5. Nikon PTIPHOT-88 Optical Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    OPTIPHOT-88 Optical Microscope micro1.jpg (69171 bytes)

  6. Modified Embedded Atom Method

    Energy Science and Technology Software Center (OSTI)

    2012-08-01

    Interatomic force and energy calculation subroutine to be used with the molecular dynamics simulation code LAMMPS (Ref a.). The code evaluated the total energy and atomic forces (energy gradient) according to a cubic spline-based variant (Ref b.) of the Modified Embedded Atom Method (MEAM) with a additional Stillinger-Weber (SW) contribution.

  7. Cryogenic immersion microscope

    DOE Patents [OSTI]

    Le Gros, Mark; Larabell, Carolyn A.

    2010-12-14

    A cryogenic immersion microscope whose objective lens is at least partially in contact with a liquid reservoir of a cryogenic liquid, in which reservoir a sample of interest is immersed is disclosed. When the cryogenic liquid has an index of refraction that reduces refraction at interfaces between the lens and the sample, overall resolution and image quality are improved. A combination of an immersion microscope and x-ray microscope, suitable for imaging at cryogenic temperatures is also disclosed.

  8. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope

    SciTech Connect (OSTI)

    Imtiaz, Atif; Wallis, Thomas M.; Brubaker, Matt D.; Blanchard, Paul T.; Bertness, Kris A.; Sanford, Norman A.; Kabos, Pavel; Weber, Joel C.; Coakley, Kevin J.

    2014-06-30

    We used a broadband, atomic-force-microscope-based, scanning microwave microscope (SMM) to probe the axial dependence of the charge depletion in a p-n junction within a gallium nitride nanowire (NW). SMM enables the visualization of the p-n junction location without the need to make patterned electrical contacts to the NW. Spatially resolved measurements of S{sub 11}{sup ?}, which is the derivative of the RF reflection coefficient S{sub 11} with respect to voltage, varied strongly when probing axially along the NW and across the p-n junction. The axial variation in S{sub 11}{sup ?}? effectively mapped the asymmetric depletion arising from the doping concentrations on either side of the junction. Furthermore, variation of the probe tip voltage altered the apparent extent of features associated with the p-n junction in S{sub 11}{sup ?} images.

  9. Infrared microscope inspection apparatus

    DOE Patents [OSTI]

    Forman, S.E.; Caunt, J.W.

    1985-02-26

    Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.

  10. Infrared microscope inspection apparatus

    DOE Patents [OSTI]

    Forman, Steven E.; Caunt, James W.

    1985-02-26

    Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface.

  11. Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Solares, Santiago D.

    2016-04-15

    Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip-sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surfacemore » as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young's modulus. Relevant cases are discussed for single-and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip-sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. As a result, a multifrequency AFM simulation tool based on the above sample model is provided as supporting information.« less

  12. Photothermally excited force modulation microscopy for broadband nanomechanical property measurements

    SciTech Connect (OSTI)

    Wagner, Ryan Killgore, Jason P.

    2015-11-16

    We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive frequency, thus avoiding the problem of spurious resonant vibrations that hinder piezoelectric excitation schemes. A complication of PTE FMM is that the sub-resonance cantilever vibration shape is fundamentally different compared to piezoelectric excitation. By directly measuring the vibrational shape of the cantilever, we show that PTE FMM is an accurate nanomechanical characterization method. PTE FMM is a pathway towards the characterization of frequency sensitive specimens such as polymers and biomaterials with frequency range limited only by the resonance frequency of the cantilever and the low frequency limit of the AFM.

  13. Manipulation of polystyrene nanoparticles on a silicon wafer in the peak force tapping mode in water: pH-dependent friction and adhesion force

    SciTech Connect (OSTI)

    Schiwek, Simon; Stark, Robert W. E-mail: dietz@csi.tu-darmstadt.de; Dietz, Christian E-mail: dietz@csi.tu-darmstadt.de; Heim, Lars-Oliver

    2015-03-14

    The friction force between nanoparticles and a silicon wafer is a crucial parameter for cleaning processes in the semiconductor industry. However, little is known about the pH-dependency of the friction forces and the shear strength at the interface. Here, we push polystyrene nanoparticles, 100 nm in diameter, with the tip of an atomic force microscope and measure the pH-dependency of the friction, adhesion, and normal forces on a silicon substrate covered with a native silicon dioxide layer. The peak force tapping mode was applied to control the vertical force on these particles. We successively increased the applied load until the particles started to move. The main advantage of this technique over single manipulation processes is the achievement of a large number of manipulation events in short time and in a straightforward manner. Geometrical considerations of the interaction forces at the tip-particle interface allowed us to calculate the friction force and shear strength from the applied normal force depending on the pH of an aqueous solution. The results clearly demonstrated that particle removal should be performed with a basic solution at pH 9 because of the low interaction forces between particle and substrate.

  14. Acoustic imaging microscope

    DOE Patents [OSTI]

    Deason, Vance A.; Telschow, Kenneth L.

    2006-10-17

    An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

  15. Ion photon emission microscope

    DOE Patents [OSTI]

    Doyle, Barney L.

    2003-04-22

    An ion beam analysis system that creates microscopic multidimensional image maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the ion-induced photons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted photons are collected in the lens system of a conventional optical microscope, and projected on the image plane of a high resolution single photon position sensitive detector. Position signals from this photon detector are then correlated in time with electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these photons initially.

  16. Solid state optical microscope

    DOE Patents [OSTI]

    Young, Ian T.

    1983-01-01

    A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

  17. Solid state optical microscope

    DOE Patents [OSTI]

    Young, I.T.

    1983-08-09

    A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal. 2 figs.

  18. Low frequency acoustic microscope

    DOE Patents [OSTI]

    Khuri-Yakub, Butrus T.

    1986-11-04

    A scanning acoustic microscope is disclosed for the detection and location of near surface flaws, inclusions or voids in a solid sample material. A focused beam of acoustic energy is directed at the sample with its focal plane at the subsurface flaw, inclusion or void location. The sample is scanned with the beam. Detected acoustic energy specularly reflected and mode converted at the surface of the sample and acoustic energy reflected by subsurface flaws, inclusions or voids at the focal plane are used for generating an interference signal which is processed and forms a signal indicative of the subsurface flaws, inclusions or voids.

  19. Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments

    SciTech Connect (OSTI)

    Oiko, V. T. A. Rodrigues, V.; Ugarte, D.; Martins, B. V. C.; Silva, P. C.

    2014-03-15

    Understanding the mechanical properties of nanoscale systems requires new experimental and theoretical tools. In particular, force sensors compatible with nanomechanical testing experiments and with sensitivity in the nN range are required. Here, we report the development and testing of a tuning-fork-based force sensor for in situ nanomanipulation experiments inside a scanning electron microscope. The sensor uses a very simple design for the electronics and it allows the direct and quantitative force measurement in the 1100 nN force range. The sensor response is initially calibrated against a nN range force standard, as, for example, a calibrated Atomic Force Microscopy cantilever; subsequently, applied force values can be directly derived using only the electric signals generated by the tuning fork. Using a homemade nanomanipulator, the quantitative force sensor has been used to analyze the mechanical deformation of multi-walled carbon nanotube bundles, where we analyzed forces in the 540 nN range, measured with an error bar of a few nN.

  20. Electron microscope phase enhancement

    DOE Patents [OSTI]

    Jin, Jian; Glaeser, Robert M.

    2010-06-15

    A microfabricated electron phase shift element is used for modifying the phase characteristics of an electron beam passing though its center aperture, while not affecting the more divergent portion of an incident beam to selectively provide a ninety-degree phase shift to the unscattered beam in the back focal plan of the objective lens, in order to realize Zernike-type, in-focus phase contrast in an electron microscope. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells. Preliminary experimental images demonstrate that these devices do apply a ninety degree phase shift as expected. Electrostatic calculations have been used to determine that fringing fields in the region of the scattered electron beams will cause a negligible phase shift as long as the ratio of electrode length to the transverse feature-size aperture is about 5:1. Calculations are underway to determine the feasibility of aspect smaller aspect ratios of about 3:1 and about 2:1.

  1. Imaging arrangement and microscope

    DOE Patents [OSTI]

    Pertsinidis, Alexandros; Chu, Steven

    2015-12-15

    An embodiment of the present invention is an imaging arrangement that includes imaging optics, a fiducial light source, and a control system. In operation, the imaging optics separate light into first and second tight by wavelength and project the first and second light onto first and second areas within first and second detector regions, respectively. The imaging optics separate fiducial light from the fiducial light source into first and second fiducial light and project the first and second fiducial light onto third and fourth areas within the first and second detector regions, respectively. The control system adjusts alignment of the imaging optics so that the first and second fiducial light projected onto the first and second detector regions maintain relatively constant positions within the first and second detector regions, respectively. Another embodiment of the present invention is a microscope that includes the imaging arrangement.

  2. The Collective Atomic Recoil Laser

    SciTech Connect (OSTI)

    Courteille, Ph.W.; Cube, C. avon; Deh, B.; Kruse, D.; Ludewig, A.; Slama, S.; Zimmermann, C.

    2005-05-05

    An ensemble of periodically ordered atoms coherently scatters the light of an incident laser beam. The scattered and the incident light may interfere and give rise to a light intensity modulation and thus to optical dipole forces which, in turn, emphasize the atomic ordering. This positive feedback is at the origin of the collective atomic recoil laser (CARL). We demonstrate this dynamics using ultracold atoms confined by dipole forces in a unidirectionally pumped far red-detuned high-finesse optical ring cavity. Under the influence of an additional dissipative force exerted by an optical molasses the atoms, starting from an unordered distribution, spontaneously form a density grating moving at constant velocity. Additionally, steady state lasing is observed in the reverse direction if the pump laser power exceeds a certain threshold. We compare the dynamics of the atomic trajectories to the behavior of globally coupled oscillators, which exhibit phase transitions from incoherent to coherent states if the coupling strength exceeds a critical value.

  3. Femtosecond photoelectron point projection microscope

    SciTech Connect (OSTI)

    Quinonez, Erik; Handali, Jonathan; Barwick, Brett

    2013-10-15

    By utilizing a nanometer ultrafast electron source in a point projection microscope we demonstrate that images of nanoparticles with spatial resolutions of the order of 100 nanometers can be obtained. The duration of the emission process of the photoemitted electrons used to make images is shown to be of the order of 100 fs using an autocorrelation technique. The compact geometry of this photoelectron point projection microscope does not preclude its use as a simple ultrafast electron microscope, and we use simple analytic models to estimate temporal resolutions that can be expected when using it as a pump-probe ultrafast electron microscope. These models show a significant increase in temporal resolution when comparing to ultrafast electron microscopes based on conventional designs. We also model the microscopes spectroscopic abilities to capture ultrafast phenomena such as the photon induced near field effect.

  4. Metal atomization spray nozzle

    DOE Patents [OSTI]

    Huxford, T.J.

    1993-11-16

    A spray nozzle for a magnetohydrodynamic atomization apparatus has a feed passage for molten metal and a pair of spray electrodes mounted in the feed passage. The electrodes, diverging surfaces which define a nozzle throat and diverge at an acute angle from the throat. Current passes through molten metal when fed through the throat which creates the Lorentz force necessary to provide atomization of the molten metal. 6 figures.

  5. Metal atomization spray nozzle

    DOE Patents [OSTI]

    Huxford, Theodore J.

    1993-01-01

    A spray nozzle for a magnetohydrodynamic atomization apparatus has a feed passage for molten metal and a pair of spray electrodes mounted in the feed passage. The electrodes, diverging surfaces which define a nozzle throat and diverge at an acute angle from the throat. Current passes through molten metal when fed through the throat which creates the Lorentz force necessary to provide atomization of the molten metal.

  6. Transmission electron microscope CCD camera

    DOE Patents [OSTI]

    Downing, Kenneth H.

    1999-01-01

    In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.

  7. Calibration of an interfacial force microscope for MEMS metrology...

    Office of Scientific and Technical Information (OSTI)

    uncertainty in each method. Authors: Houston, Jack E. ; Baker, Michael Sean ; Crowson, Douglas A. ; Mitchell, John Anthony ; Moore, Nathan W. Publication Date: 2009-10-01 OSTI...

  8. Nonlocal microscopic theory of Casimir forces at finite temperature

    SciTech Connect (OSTI)

    Despoja, V.; Marusic, L.

    2011-04-15

    The interaction energy between two metallic slabs in the retarded limit at finite temperature is expressed in terms of surface polariton propagators for separate slabs, avoiding the usual matching procedure, with both diamagnetic and paramagnetic excitations included correctly. This enables appropriate treatment of arbitrary electron density profiles and fully nonlocal electronic response, including both collective and single-particle excitations. The results are verified by performing the nonretarded and long-wavelength (local) limits and showing that they reduce to the previously obtained expressions. Possibilities for practical use of the theory are explored by applying it to calculation of various contributions to the Casimir energy between two silver slabs.

  9. Calibration of an interfacial force microscope for MEMS metrology...

    Office of Scientific and Technical Information (OSTI)

    Authors: Houston, Jack E. ; Baker, Michael Sean ; Crowson, Douglas A. ; Mitchell, John Anthony ; Moore, Nathan W. Publication Date: 2009-10-01 OSTI Identifier: 1001011 Report ...

  10. Scientists View Battery Under Microscope

    SciTech Connect (OSTI)

    2015-04-10

    PNNL researchers use a special microscope setup that shows the inside of a battery as it charges and discharges. This battery-watching microscope is located at EMSL, DOE's Environmental Molecular Sciences Laboratory that resides at PNNL. Researchers the world over can visit EMSL and use special instruments like this, many of which are the only one of their kind available to scientists.

  11. Effect of current compliance and voltage sweep rate on the resistive switching of HfO{sub 2}/ITO/Invar structure as measured by conductive atomic force microscopy

    SciTech Connect (OSTI)

    Wu, You-Lin Liao, Chun-Wei; Ling, Jing-Jenn

    2014-06-16

    The electrical characterization of HfO{sub 2}/ITO/Invar resistive switching memory structure was studied using conductive atomic force microscopy (AFM) with a semiconductor parameter analyzer, Agilent 4156C. The metal alloy Invar was used as the metal substrate to ensure good ohmic contact with the substrate holder of the AFM. A conductive Pt/Ir AFM tip was placed in direct contact with the HfO{sub 2} surface, such that it acted as the top electrode. Nanoscale current-voltage (I-V) characteristics of the HfO{sub 2}/ITO/Invar structure were measured by applying a ramp voltage through the conductive AFM tip at various current compliances and ramp voltage sweep rates. It was found that the resistance of the low resistance state (RLRS) decreased with increasing current compliance value, but resistance of high resistance state (RHRS) barely changed. However, both the RHRS and RLRS decreased as the voltage sweep rate increased. The reasons for this dependency on current compliance and voltage sweep rate are discussed.

  12. Atomic-scale studies on the effect of boundary coherency on stability in twinned Cu

    SciTech Connect (OSTI)

    Niu, Rongmei; Han, Ke Su, Yi-Feng; Salters, Vincent J.

    2014-01-06

    The stored energy and hardness of nanotwinned (NT) Cu are related to interaction between dislocations and (111)-twin boundaries (TBs) studied at atomic scales by high-angle annular dark-field scanning transmission electron microscope. Lack of mobile dislocations at coherent TBs (CTBs) provides as-deposited NT Cu a rare combination of stability and hardness. The introduction of numerous incoherent TBs (ITBs) reduces both the stability and hardness. While storing more energy in their ITBs than in the CTBs, deformed NT Cu also exhibits high dislocation density and TB mobility and therefore has increased the driving force for recovery, coarsening, and recrystallization.

  13. MEAM interatomic force calculation subroutine for LAMMPS

    Energy Science and Technology Software Center (OSTI)

    2010-10-25

    Interatomic force and energy calculation subroutine tobe used with the molecular dynamics simulation code LAMMPS (Ref a.). The code evaluates the total energy and atomic forces (energy gradient) according to cubic spine-based variant (Ref b.) of the Modified Embedded Atom Method (MEAM).

  14. protective force

    National Nuclear Security Administration (NNSA)

    ntex%20-%20protective%20force%20-%20edited.jpg" alt"successfully completed a recent assessment by the U.S. Department " >

    Members of Pantex's Protective Force on...

  15. HIGH TEMPERATURE MICROSCOPE AND FURNACE

    DOE Patents [OSTI]

    Olson, D.M.

    1961-01-31

    A high-temperature microscope is offered. It has a reflecting optic situated above a molten specimen in a furnace and reflecting the image of the same downward through an inert optic member in the floor of the furnace, a plurality of spaced reflecting plane mirrors defining a reflecting path around the furnace, a standard microscope supported in the path of and forming the end terminus of the light path.

  16. Atomic force microscopy and x-ray photoelectron spectroscopy investigations of the morphology and chemistry of a PdCl{sub 2}/SnCl{sub 2} electroless plating catalysis system adsorbed onto shape memory alloy particles

    SciTech Connect (OSTI)

    Silvain, J.F.; Fouassier, O.; Lescaux, S.

    2004-11-01

    A study of the different stages of the electroless deposition of copper on micronic NiTi shape memory alloy particles activated by one-step and two-step methods has been conducted from both a chemical and a morphological point of view. The combination of x-ray photoelectron spectroscopy (XPS) measurements and atomic force microscopy (AFM) imaging has allowed detection of the distribution of the formed compounds and depth quantification and estimation of the surface topographic parameters. For the two-step method, at the sensitization of the early stages, it is observed by AFM that Sn is absorbed in form of clusters that tend to completely cover the surface and form a continuous film. XPS analysis have shown that Sn and Pd are first absorbed in form of oxide (SnO{sub 2} and PdO) and hydroxide [Sn(OH){sub 4}]. After the entire sensitization step, the NiTi substrate is covered with Sn-based compounds. After the sensitization and the activation steps the powder roughness increases. Behavior of the Sn and Pd growth for the one-step method does not follow the behavior found for the two-step method. Indeed, XPS analysis shows a three-dimensional (3D) growth of Pd clusters on top of a mixture of metallic tin, oxide (SnO) and hydroxide [Sn(OH){sub 2}]. These Pd clusters are covered with a thin layer of Pd-oxide contamination induced by the electroless process. The mean roughness for the one-step and two-step processes are equivalent. After copper deposition, the decrease of mean roughness is attributed to a filling of surface valleys, observed after the Sn-Pd coating step.

  17. Microscopic Description of Induced Nuclear Fission (Conference...

    Office of Scientific and Technical Information (OSTI)

    Microscopic Description of Induced Nuclear Fission Citation Details In-Document Search Title: Microscopic Description of Induced Nuclear Fission You are accessing a document ...

  18. Fourth Fridays Downtown - Under the Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    the Microscope: Explore the natural world through the eyes of microscopes. Examine pond water, plants, fibers, pollen, and more. August 28 - Robotics Night at the Museum: Try...

  19. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Disorder-Induced Microscopic Magnetic Memory Print Wednesday, 26 October 2005 00:00 The magnetic-recording industry deliberately...

  20. Circular dichroism in the electron microscope: Progress and applications (invited)

    SciTech Connect (OSTI)

    Schattschneider, P.; Loeffler, S.; Ennen, I.; Stoeger-Pollach, M.; Verbeeck, J.

    2010-05-15

    According to theory, x-ray magnetic circular dichroism in a synchrotron is equivalent to energy loss magnetic chiral dichroism (EMCD) in a transmission electron microscope (TEM). After a synopsis of the development of EMCD, the theoretical background is reviewed and recent results are presented, focusing on the study of magnetic nanoparticles for ferrofluids and Heusler alloys for spintronic devices. Simulated maps of the dichroic strength as a function of atom position in the crystal allow evaluating the influence of specimen thickness and sample tilt on the experimental EMCD signal. Finally, the possibility of direct observation of chiral electronic transitions with atomic resolution in a TEM is discussed.

  1. Microscope and method of use

    DOE Patents [OSTI]

    Bongianni, Wayne L.

    1984-01-01

    A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers.

  2. Microscope and method of use

    DOE Patents [OSTI]

    Bongianni, W.L.

    1984-04-17

    A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers. 7 figs.

  3. air force

    National Nuclear Security Administration (NNSA)

    en NNSA, Air Force Complete Successful B61-12 Life Extension Program Development Flight Test at Tonopah Test Range http:nnsa.energy.govmediaroompressreleases...

  4. Long working distance interference microscope

    DOE Patents [OSTI]

    Sinclair, Michael B.; DeBoer, Maarten P.; Smith, Norman F.

    2004-04-13

    Disclosed is a long working distance interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. The long working distance of 10-30 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-D height profiles of MEMS test structures to be acquired across an entire wafer. A well-matched pair of reference/sample objectives is not required, significantly reducing the cost of this microscope, as compared to a Linnik microinterferometer.

  5. Multi-dimensional modelling of electrostatic force distance curve over dielectric surface: Influence of tip geometry and correlation with experiment

    SciTech Connect (OSTI)

    Boularas, A. Baudoin, F.; Villeneuve-Faure, C.; Clain, S.; Teyssedre, G.

    2014-08-28

    Electric Force-Distance Curves (EFDC) is one of the ways whereby electrical charges trapped at the surface of dielectric materials can be probed. To reach a quantitative analysis of stored charge quantities, measurements using an Atomic Force Microscope (AFM) must go with an appropriate simulation of electrostatic forces at play in the method. This is the objective of this work, where simulation results for the electrostatic force between an AFM sensor and the dielectric surface are presented for different bias voltages on the tip. The aim is to analyse force-distance curves modification induced by electrostatic charges. The sensor is composed by a cantilever supporting a pyramidal tip terminated by a spherical apex. The contribution to force from cantilever is neglected here. A model of force curve has been developed using the Finite Volume Method. The scheme is based on the Polynomial Reconstruction OperatorPRO-scheme. First results of the computation of electrostatic force for different tipsample distances (from 0 to 600?nm) and for different DC voltages applied to the tip (6 to 20?V) are shown and compared with experimental data in order to validate our approach.

  6. Scanning tunneling microscope nanoetching method

    DOE Patents [OSTI]

    Li, Yun-Zhong; Reifenberger, Ronald G.; Andres, Ronald P.

    1990-01-01

    A method is described for forming uniform nanometer sized depressions on the surface of a conducting substrate. A tunneling tip is used to apply tunneling current density sufficient to vaporize a localized area of the substrate surface. The resulting depressions or craters in the substrate surface can be formed in information encoding patterns readable with a scanning tunneling microscope.

  7. ATOM | NISAC

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    NISACATOM content top Network Optimization Models (RNAS and ATOM) Posted by Admin on Mar 1, 2012 in | Comments 0 comments Many critical infrastructures can be represented by a...

  8. Force sensor

    DOE Patents [OSTI]

    Grahn, A.R.

    1993-05-11

    A force sensor and related method for determining force components is described. The force sensor includes a deformable medium having a contact surface against which a force can be applied, a signal generator for generating signals that travel through the deformable medium to the contact surface, a signal receptor for receiving the signal reflected from the contact surface, a generation controller, a reception controller, and a force determination apparatus. The signal generator has one or more signal generation regions for generating the signals. The generation controller selects and activates the signal generation regions. The signal receptor has one or more signal reception regions for receiving signals and for generating detections signals in response thereto. The reception controller selects signal reception regions and detects the detection signals. The force determination apparatus measures signal transit time by timing activation and detection and, optionally, determines force components for selected cross-field intersections. The timer which times by activation and detection can be any means for measuring signal transit time. A cross-field intersection is defined by the overlap of a signal generation region and a signal reception region.

  9. Force sensor

    DOE Patents [OSTI]

    Grahn, Allen R.

    1993-01-01

    A force sensor and related method for determining force components. The force sensor includes a deformable medium having a contact surface against which a force can be applied, a signal generator for generating signals that travel through the deformable medium to the contact surface, a signal receptor for receiving the signal reflected from the contact surface, a generation controller, a reception controller, and a force determination apparatus. The signal generator has one or more signal generation regions for generating the signals. The generation controller selects and activates the signal generation regions. The signal receptor has one or more signal reception regions for receiving signals and for generating detections signals in response thereto. The reception controller selects signal reception regions and detects the detection signals. The force determination apparatus measures signal transit time by timing activation and detection and, optionally, determines force components for selected cross-field intersections. The timer which times by activation and detection can be any means for measuring signal transit time. A cross-field intersection is defined by the overlap of a signal generation region and a signal reception region.

  10. Sensing Current and Forces with SPM

    SciTech Connect (OSTI)

    Park, Jeong Y.; Maier, Sabine; Hendriksen, Bas; Salmeron, Miquel

    2010-07-02

    Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces during STM and the detection of currents during AFM can give valuable additional information of the nanoscale material properties.

  11. Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2005-08-26

    Establishes requirements for management and operation of the DOE Protective Force (PF), establishes requirements for firearms operations and defines the firearms courses of fire. Cancels: DOE M 473.2-1A DOE M 473.2-2

  12. Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2006-03-07

    The manual establishes requirements for management and operation of the DOE Protective Force, establishes requirements for firearms operations and defines the firearms courses of fire. Chg 1 dated 3/7/06. DOE M 470.4-3A cancels DOE M 470.4-3, Chg 1, Protective Force, dated 3-7-06, Attachment 2, Contractor Requirement Document (CRD) only (except for Section C). Chg 1, dated 3-7-06, cancels DOE M 470.4-3

  13. Fabrication of large area plasmonic nanoparticle grating structure on silver halide based transmission electron microscope film and its application as a surface enhanced Raman spectroscopy substrate

    SciTech Connect (OSTI)

    Sudheer, Tiwari, P.; Singh, M. N.; Sinha, A. K.; Rai, V. N.; Srivastava, A. K.; Bhartiya, S.; Mukherjee, C.

    2015-08-14

    The plasmonic responses of silver nanoparticle grating structures of different periods made on silver halide based electron microscope film are investigated. Raster scan of the conventional scanning electron microscope (SEM) is used to carry out electron beam lithography for fabricating the plasmonic nanoparticle grating (PNG) structures. Morphological characterization of the PNG structures, carried out by the SEM and the atomic force microscope, indicates that the depth of the groove decreases with a decrease in the grating period. Elemental characterization performed by the energy dispersive spectroscopy and the x-ray diffraction shows the presence of nanoparticles of silver in the PNG grating. The optical characterization of the gratings shows that the localized surface plasmon resonance peak shifts from 366 to 378 nm and broadens with a decrease in grating period from 10 to 2.5 μm. The surface enhanced Raman spectroscopy of the Rhodamine-6G dye coated PNG structure shows the maximum enhancement by two orders of magnitude in comparison to the randomly distributed silver nanoparticles having similar size and shape as the PNG structure.

  14. Development of a detachable high speed miniature scanning probe microscope for large area substrates inspection

    SciTech Connect (OSTI)

    Sadeghian, Hamed E-mail: h.sadeghianmarnani@tudelft.nl; Herfst, Rodolf; Winters, Jasper; Crowcombe, Will; Kramer, Geerten; Dool, Teun van den; Es, Maarten H. van

    2015-11-15

    We have developed a high speed, miniature scanning probe microscope (MSPM) integrated with a Positioning Unit (PU) for accurately positioning the MSPM on a large substrate. This combination enables simultaneous, parallel operation of many units on a large sample for high throughput measurements. The size of the MSPM is 19 × 45 × 70 mm{sup 3}. It contains a one-dimensional flexure stage with counter-balanced actuation for vertical scanning with a bandwidth of 50 kHz and a z-travel range of more than 2 μm. This stage is mechanically decoupled from the rest of the MSPM by suspending it on specific dynamically determined points. The motion of the probe, which is mounted on top of the flexure stage is measured by a very compact optical beam deflection (OBD). Thermal noise spectrum measurements of short cantilevers show a bandwidth of 2 MHz and a noise of less than 15 fm/Hz{sup 1/2}. A fast approach and engagement of the probe to the substrate surface have been achieved by integrating a small stepper actuator and direct monitoring of the cantilever response to the approaching surface. The PU has the same width as the MSPM, 45 mm and can position the MSPM to a pre-chosen position within an area of 275×30 mm{sup 2} to within 100 nm accuracy within a few seconds. During scanning, the MSPM is detached from the PU which is essential to eliminate mechanical vibration and drift from the relatively low-resonance frequency and low-stiffness structure of the PU. Although the specific implementation of the MSPM we describe here has been developed as an atomic force microscope, the general architecture is applicable to any form of SPM. This high speed MSPM is now being used in a parallel SPM architecture for inspection and metrology of large samples such as semiconductor wafers and masks.

  15. Solid-state optical microscope

    DOE Patents [OSTI]

    Young, I.T.

    1981-01-07

    A solid state optical microscope is described wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. Means for scanning in one of two orthogonal directions are provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

  16. Measurement of Semiconductor Surface Potential using the Scanning Electron Microscope

    SciTech Connect (OSTI)

    Heath, J. T.; Jiang, C. S.; Al-Jassim, M. M.

    2012-02-15

    We calibrate the secondary electron signal from a standard scanning electron microscope to voltage, yielding an image of the surface or near-surface potential. Data on both atomically abrupt heterojunction GaInP/GaAs and diffused homojunction Si solar cell devices clearly show the expected variation in potential with position and applied bias, giving depletion widths and locating metallurgical junctions to an accuracy better than 10 nm. In some images, distortion near the p-n junction is observed, seemingly consistent with the effects of lateral electric fields (patch fields). Reducing the tube bias removes this distortion. This approach results in rapid and straightforward collection of near-surface potential data using a standard scanning electron microscope.

  17. Preliminary studies of the use of an automated flow-cell electrodeposition system for the formation of CdTe thin films by electrochemical atomic layer epitaxy

    SciTech Connect (OSTI)

    Huang, B.M.; Colletti, L.P.; Gregory, B.W.; Anderson, J.L.; Stickney, J.L.

    1995-09-01

    This paper is the first report of the formation of thin films, thicker than ten monolayers, using electrochemical atomic layer epitaxy (ECALE). Thin films of CdTe have been electrodeposited on polycrystalline gold substrates in an electrochemical thin-layer flow-cell deposition system using the ECALE methodology. Studies of the deposit morphology have been performed using scanning electron microscopy and atomic force microscope Significant improvements in deposit morphology are reported as a result of changes to the ECALE cycle program and deposition hardware. Deposit components analyzed using electron probe microanalysis and inductively coupled plasma atomic emission spectrometry, were found to be stoichiometric and nearly independent of the number of cycles and the Cd deposition potential. In addition, the deposition rate was shown to be one CdTe monolayer per cycle (half monolayer of Cd and half monolayer of Te per ECALE cycle).

  18. Atom Interferometry

    ScienceCinema (OSTI)

    Mark Kasevich

    2010-01-08

    Atom de Broglie wave interferometry has emerged as a tool capable of addressing a diverse set of questions in gravitational and condensed matter physics, and as an enabling technology for advanced sensors in geodesy and navigation. This talk will review basic principles, then discuss recent applications and future directions. Scientific applications to be discussed include measurement of G (Newton?s constant), tests of the Equivalence Principle and post-Newtonian gravity, and study of the Kosterlitz-Thouless phase transition in layered superfluids. Technology applications include development of precision gryoscopes and gravity gradiometers. The talk will conclude with speculative remarks looking to the future: Can atom interference methods be sued to detect gravity waves? Can non-classical (entangled/squeezed state) atom sources lead to meaningful sensor performance improvements?

  19. Atom Interferometry

    SciTech Connect (OSTI)

    Mark Kasevich

    2008-05-07

    Atom de Broglie wave interferometry has emerged as a tool capable of addressing a diverse set of questions in gravitational and condensed matter physics, and as an enabling technology for advanced sensors in geodesy and navigation. This talk will review basic principles, then discuss recent applications and future directions. Scientific applications to be discussed include measurement of G (Newton’s constant), tests of the Equivalence Principle and post-Newtonian gravity, and study of the Kosterlitz-Thouless phase transition in layered superfluids. Technology applications include development of precision gryoscopes and gravity gradiometers. The talk will conclude with speculative remarks looking to the future: Can atom interference methods be sued to detect gravity waves? Can non-classical (entangled/squeezed state) atom sources lead to meaningful sensor performance improvements?

  20. Atomic layer deposition of epitaxial layers of anatase on strontium titanate single crystals: Morphological and photoelectrochemical characterization

    SciTech Connect (OSTI)

    Kraus, Theodore J.; Nepomnyashchii, Alexander B.; Parkinson, B. A.

    2015-01-15

    Atomic layer deposition was used to grow epitaxial layers of anatase (001) TiO{sub 2} on the surface of SrTiO{sub 3} (100) crystals with a 3% lattice mismatch. The epilayers grow as anatase (001) as confirmed by x-ray diffraction. Atomic force microscope images of deposited films showed epitaxial layer-by-layer growth up to about 10 nm, whereas thicker films, of up to 32 nm, revealed the formation of 2–5 nm anatase nanocrystallites oriented in the (001) direction. The anatase epilayers were used as substrates for dye sensitization. The as received strontium titanate crystal was not sensitized with a ruthenium-based dye (N3) or a thiacyanine dye (G15); however, photocurrent from excited state electron injection from these dyes was observed when adsorbed on the anatase epilayers. These results show that highly ordered anatase surfaces can be grown on an easily obtained substrate crystal.

  1. Investigation on dielectric properties of atomic layer deposited Al{sub 2}O{sub 3} dielectric films

    SciTech Connect (OSTI)

    Y?ld?z, Dilber Esra; Y?ld?r?m, Mert; Gken, Muharrem

    2014-05-15

    Al/Al{sub 2}O{sub 3}/p-Si Schottky barrier diodes (SBDs) were fabricated using atomic layer deposition technique in order to investigate dielectric properties of SBDs. For this purpose, admittance measurements were conducted at room temperature between ?1?V and 3?V in the frequency range of 10 kHz and 1?MHz. In addition to the investigation of Al{sub 2}O{sub 3} morphology using atomic force microscope, dielectric parameters; such as dielectric constant (??), dielectric loss (??), dielectric loss tangent (tan??), and real and imaginary parts of dielectric modulus (M? and M?, respectively), were calculated and effect of frequency on these parameters of Al/Al{sub 2}O{sub 3}/p-Si SBDs was discussed. Variations in these parameters at low frequencies were associated with the effect of interface states in low frequency region. Besides dielectric parameters, ac electrical conductivity of these SBDs was also investigated.

  2. A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization

    SciTech Connect (OSTI)

    Berger, Andrew J. Page, Michael R.; Young, Justin R.; Bhallamudi, Vidya P.; Johnston-Halperin, Ezekiel; Pelekhov, Denis V.; Hammel, P. Chris; Jacob, Jan; Lewis, Jim; Wenzel, Lothar

    2014-12-15

    Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

  3. Lift Forces

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Lift Forces in Bubbly Flows Thomas Daly ∗ , Sreekanth Pannala † , Arthur Ruggles ∗ ∗ Department of Nuclear Engineering, University of Tennessee, 315 Pasqua Engineering Building, Knoxville, TN, 37996-2300 † Oak Ridge National Laboratory, P.O. Box 2008, Bldg. 5700, MS 6164 Oak Ridge, TN 37831-6164 tdaly1@utk.edu, pannalas@ornl.gov, aruggles@utk.edu INTRODUCTION Multiphase flows are found in a variety of engineering systems, two of the most notable categories being energy pro- duction and

  4. Fourth Fridays Downtown - Under the Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Fourth Fridays Downtown - Under the Microscope Fourth Fridays Downtown - Under the Microscope WHEN: Jul 24, 2015 4:00 PM - 6:00 PM WHERE: Bradbury Science Museum 1350 Central Ave, Los Alamos, NM 87544, USA CONTACT: Jessica Privette 505 667-0375 CATEGORY: Bradbury INTERNAL: Calendar Login Under the Microscope Event Description The museum will be open late until 6pm every Fourth Friday offering extended access to exhibits, special programming, and activities. The Los Alamos Creative District is

  5. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Disorder-Induced Microscopic Magnetic Memory Print Wednesday, 26 October 2005 00:00 The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over

  6. Nanomaterials Analysis using a Scanning Electron Microscope ...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Nanomaterials Analysis using a Scanning Electron Microscope Technology available for licensing: Steradian X-ray detection system increases the detection capability of SEMs during...

  7. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired...

  8. Ponderomotive phase plate for transmission electron microscopes...

    Office of Scientific and Technical Information (OSTI)

    A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high ...

  9. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Schultz, Peter G.; Wei, Tao

    2003-01-01

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  10. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen

    2001-01-01

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  11. Quantum computations with atoms in optical lattices: Marker qubits and molecular interactions

    SciTech Connect (OSTI)

    Calarco, T.; Dorner, U.; Zoller, P.; Julienne, P.S.; Williams, C.J.

    2004-07-01

    We develop a scheme for quantum computation with neutral atoms, based on the concept of 'marker' atoms, i.e., auxiliary atoms that can be efficiently transported in state-independent periodic external traps to operate quantum gates between physically distant qubits. This allows for relaxing a number of experimental constraints for quantum computation with neutral atoms in microscopic potential, including single-atom laser addressability. We discuss the advantages of this approach in a concrete physical scenario involving molecular interactions.

  12. Robotic CCD microscope for enhanced crystal recognition

    DOE Patents [OSTI]

    Segelke, Brent W.; Toppani, Dominique

    2007-11-06

    A robotic CCD microscope and procedures to automate crystal recognition. The robotic CCD microscope and procedures enables more accurate crystal recognition, leading to fewer false negative and fewer false positives, and enable detection of smaller crystals compared to other methods available today.

  13. If Only We Could Account For Every Atom (LBNL Summer Lecture Series)

    ScienceCinema (OSTI)

    Kisielowski, Christian

    2014-05-06

    Christian Kisielowski, an expert in electron microscopy at Lawrence Berkeley National Laboratory, investigates ways to allow studies of single atoms using sophisticated microscopes and imaginative techniques. His goal is to account for every atom in the interior of both simple and complex materials. Find out how he and his colleagues are breaking the barriers to account for every atom.

  14. Atomic friction at exposed and buried graphite step edges: Experiments and simulations

    SciTech Connect (OSTI)

    Ye, Zhijiang; Martini, Ashlie

    2015-06-08

    The surfaces of layered materials such as graphite exhibit step edges that affect friction. Step edges can be exposed, where the step occurs at the outmost layer, or buried, where the step is underneath another layer of material. Here, we study friction at exposed and buried step edges on graphite using an atomic force microscope (AFM) and complementary molecular dynamics simulations of the AFM tip apex. Exposed and buried steps exhibit distinct friction behavior, and the friction on either step is affected by the direction of sliding, i.e., moving up or down the step, and the bluntness of the tip. These trends are analyzing in terms of the trajectory of the AFM tip as it moves over the step, which is a convolution of the topography of the surface and the tip shape.

  15. Atomic magnetometer

    DOE Patents [OSTI]

    Schwindt, Peter; Johnson, Cort N.

    2012-07-03

    An atomic magnetometer is disclosed which uses a pump light beam at a D1 or D2 transition of an alkali metal vapor to magnetically polarize the vapor in a heated cell, and a probe light beam at a different D2 or D1 transition to sense the magnetic field via a polarization rotation of the probe light beam. The pump and probe light beams are both directed along substantially the same optical path through an optical waveplate and through the heated cell to an optical filter which blocks the pump light beam while transmitting the probe light beam to one or more photodetectors which generate electrical signals to sense the magnetic field. The optical waveplate functions as a quarter waveplate to circularly polarize the pump light beam, and as a half waveplate to maintain the probe light beam linearly polarized.

  16. Displacement per Atom, Primary Knocked-on Atoms Produced in an Atomic Solid Target

    Energy Science and Technology Software Center (OSTI)

    2015-07-01

    Version 00 DART calculates the total number of displacements, primary knocked-on atoms, recoil spectra, displacement cross sections and displacement per atoms rates in a poly atomic solid target, composed of many different isotopes, using ENDF/B-VI derived cross sections. To calculate these values, different incident particles were considered: neutrons, ions and electrons. The user needs only to specify an incident particle energy spectrum and the composition of the target. The number of displaced atoms is calculatedmore » within the Binary Collision Approximation framework. To calculate the number of displacements the DART code does not use the classical NRT dpa analytical formula, which is only appropriate for projectile and target of the same mass. It numerically solves the linearized Boltzmann equation for a polyatomic target. It can be a useful tool to select the nature and energy of ions or electrons in particle accelerators or electron microscopes to mimic the primary damage induced by neutron irradiation in nuclear plants or fission facilities. Nuclear data: • Typically any ENDFB format evaluation may be used. This package includes the ENDFB-VI nuclear data library. Energy ranges: • Neutron or ion : 10E-11 to 20 MeV Data library distributed with DART v1.0: • ENDFB-VI nuclear data library« less

  17. Note: Long-range scanning tunneling microscope for the study of nanostructures on insulating substrates

    SciTech Connect (OSTI)

    Molina-Mendoza, Aday J.; Rodrigo, Jos G.; Rubio-Bollinger, Gabino; Island, Joshua; Burzuri, Enrique; Zant, Herre S. J. van der; Agrat, Nicols; Condensed Matter Physics Center and Instituto Universitario de Ciencia de Materiales Nicols Cabrera, Universidad Autnoma de Madrid, Campus de Cantoblanco, E-28049 Madrid; Instituto Madrileo de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, E-28049 Madrid

    2014-02-15

    The scanning tunneling microscope (STM) is a powerful tool for studying the electronic properties at the atomic level, however, it is of relatively small scanning range and the fact that it can only operate on conducting samples prevents its application to study heterogeneous samples consisting of conducting and insulating regions. Here we present a long-range scanning tunneling microscope capable of detecting conducting micro and nanostructures on insulating substrates using a technique based on the capacitance between the tip and the sample and performing STM studies.

  18. Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision

    SciTech Connect (OSTI)

    Jesse, Stephen; He, Qian; Lupini, Andrew R.; Leonard, Donovan N.; Oxley, Mark P.; Ovchinnikov, Oleg; Unocic, Raymond R.; Tselev, Alexander; Fuentes-Cabrera, Miguel; Sumpter, Bobby G.; Pennycook, Stephen J.; Kalinin, Sergei V.; Borisevich, Albina Y.

    2015-10-19

    We demonstrate atomic-level sculpting of 3D crystalline oxide nanostructures from metastable amorphous layer in a scanning transmission electron microscope (STEM). Strontium titanate nanostructures grow epitaxially from the crystalline substrate following the beam path. This method can be used for fabricating crystalline structures as small as 1-2 nm and the process can be observed in situ with atomic resolution. We further demonstrate fabrication of arbitrary shape structures via control of the position and scan speed of the electron beam. Combined with broad availability of the atomic resolved electron microscopy platforms, these observations suggest the feasibility of large scale implementation of bulk atomic-level fabrication as a new enabling tool of nanoscience and technology, providing a bottom-up, atomic-level complement to 3D printing.

  19. Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Jesse, Stephen; He, Qian; Lupini, Andrew R.; Leonard, Donovan N.; Oxley, Mark P.; Ovchinnikov, Oleg; Unocic, Raymond R.; Tselev, Alexander; Fuentes-Cabrera, Miguel; Sumpter, Bobby G.; et al

    2015-10-19

    We demonstrate atomic-level sculpting of 3D crystalline oxide nanostructures from metastable amorphous layer in a scanning transmission electron microscope (STEM). Strontium titanate nanostructures grow epitaxially from the crystalline substrate following the beam path. This method can be used for fabricating crystalline structures as small as 1-2 nm and the process can be observed in situ with atomic resolution. We further demonstrate fabrication of arbitrary shape structures via control of the position and scan speed of the electron beam. Combined with broad availability of the atomic resolved electron microscopy platforms, these observations suggest the feasibility of large scale implementation of bulkmore » atomic-level fabrication as a new enabling tool of nanoscience and technology, providing a bottom-up, atomic-level complement to 3D printing.« less

  20. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in...

  1. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits...

  2. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  3. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  4. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  5. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  6. X-ray laser microscope apparatus

    DOE Patents [OSTI]

    Suckewer, Szymon; DiCicco, Darrell S.; Hirschberg, Joseph G.; Meixler, Lewis D.; Sathre, Robert; Skinner, Charles H.

    1990-01-01

    A microscope consisting of an x-ray contact microscope and an optical microscope. The optical, phase contrast, microscope is used to align a target with respect to a source of soft x-rays. The source of soft x-rays preferably comprises an x-ray laser but could comprise a synchrotron or other pulse source of x-rays. Transparent resist material is used to support the target. The optical microscope is located on the opposite side of the transparent resist material from the target and is employed to align the target with respect to the anticipated soft x-ray laser beam. After alignment with the use of the optical microscope, the target is exposed to the soft x-ray laser beam. The x-ray sensitive transparent resist material whose chemical bonds are altered by the x-ray beam passing through the target mater GOVERNMENT LICENSE RIGHTS This invention was made with government support under Contract No. De-FG02-86ER13609 awarded by the Department of Energy. The Government has certain rights in this invention.

  7. Ringleader: Ken Goldberg

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    defects with great detail. Unlike conventional microscopes, electron microscopes, and atomic-force microscopes (AFM), SHARP operates with extreme-ultraviolet (EUV) light, near...

  8. WETTABILITY AND IMBIBITION: MICROSCOPIC DISTRIBUTION OF WETTING AND ITS CONSEQUENCES AT THE CORE AND FIELD SCALES

    SciTech Connect (OSTI)

    Jill S. Buckley; Norman R. Morrow; Chris Palmer; Purnendu K. Dasgupta

    2003-02-01

    The questions of reservoir wettability have been approached in this project from three directions. First, we have studied the properties of crude oils that contribute to wetting alteration in a reservoir. A database of more than 150 different crude oil samples has been established to facilitate examination of the relationships between crude oil chemical and physical properties and their influence on reservoir wetting. In the course of this work an improved SARA analysis technique was developed and major advances were made in understanding asphaltene stability including development of a thermodynamic Asphaltene Solubility Model (ASM) and empirical methods for predicting the onset of instability. The CO-Wet database is a resource that will be used to guide wettability research in the future. The second approach is to study crude oil/brine/rock interactions on smooth surfaces. Contact angle measurements were made under controlled conditions on mica surfaces that had been exposed to many of the oils in the CO-Wet database. With this wealth of data, statistical tests can now be used to examine the relationships between crude oil properties and the tendencies of those oils to alter wetting. Traditionally, contact angles have been used as the primary wetting assessment tool on smooth surfaces. A new technique has been developed using an atomic forces microscope that adds a new dimension to the ability to characterize oil-treated surfaces. Ultimately we aim to understand wetting in porous media, the focus of the third approach taken in this project. Using oils from the CO-Wet database, experimental advances have been made in scaling the rate of imbibition, a sensitive measure of core wetting. Application of the scaling group to mixed-wet systems has been demonstrated for a range of core conditions. Investigations of imbibition in gas/liquid systems provided the motivation for theoretical advances as well. As a result of this project we have many new tools for studying

  9. Highly charged ion based time of flight emission microscope

    DOE Patents [OSTI]

    Barnes, Alan V.; Schenkel, Thomas; Hamza, Alex V.; Schneider, Dieter H.; Doyle, Barney

    2001-01-01

    A highly charged ion based time-of-flight emission microscope has been designed, which improves the surface sensitivity of static SIMS measurements because of the higher ionization probability of highly charged ions. Slow, highly charged ions are produced in an electron beam ion trap and are directed to the sample surface. The sputtered secondary ions and electrons pass through a specially designed objective lens to a microchannel plate detector. This new instrument permits high surface sensitivity (10.sup.10 atoms/cm.sup.2), high spatial resolution (100 nm), and chemical structural information due to the high molecular ion yields. The high secondary ion yield permits coincidence counting, which can be used to enhance determination of chemical and topological structure and to correlate specific molecular species.

  10. Observation of Materials Processes in Liquids in the Electron Microscope

    SciTech Connect (OSTI)

    Wang, Chong M.; Liao, Honggang; Ross, Frances M.

    2015-01-01

    Materials synthesis and the functioning of devices often indispensably involve liquid media. But direct visualization of dynamic process in liquids, especially with high spatial and temporal resolution, has been challenging. For solid materials, advances in aberration corrected electron microscopy have made observation of atomic level features a routine practice. Here we discuss the extent to which one can take advantage of the resolution of modern electron microscopes to image phenomenon occuring in liquids. We will describe the fundamentals of two different experimental approaches, closed and open liquid cells. We will illustrate the capabilities of each approach by considering processes in batteries and nucleation and growth of nanoparticles from solution. We conclude that liquid cell electron microscopy appears to be duly fulfilling its role for in situ studies of nanoscale processes in liquids, revealing physical and chemical processes otherwise difficult to observe.

  11. HRTEM Imaging of Atoms at Sub-Angstrom Resolution

    SciTech Connect (OSTI)

    O'Keefe, Michael A.; Allard, Lawrence F.; Blom, Douglas A.

    2005-04-06

    John Cowley and his group at Arizona State University pioneered the use of transmission electron microscopy (TEM) for high-resolution imaging. Images were achieved three decades ago showing the crystal unit cell content at better than 4 Angstrom resolution. This achievement enabled researchers to pinpoint the positions of heavy atom columns within the unit cell. Lighter atoms appear as resolution is improved to sub-Angstrom levels. Currently, advanced microscopes can image the columns of the light atoms (carbon, oxygen, nitrogen) that are present in many complex structures, and even the lithium atoms present in some battery materials. Sub-Angstrom imaging, initially achieved by focal-series reconstruction of the specimen exit surface wave, will become common place for next-generation electron microscopes with CS-corrected lenses and monochromated electron beams. Resolution can be quantified in terms of peak separation and inter-peak minimum, but the limits imposed on the attainable resolution by the properties of the micro-scope specimen need to be considered. At extreme resolution the ''size'' of atoms can mean that they will not be resolved even when spaced farther apart than the resolution of the microscope.

  12. Ultrafast chirped optical waveform recorder using a time microscope...

    Office of Scientific and Technical Information (OSTI)

    DOepatents Search Results Ultrafast chirped optical waveform recorder using a time microscope Title: Ultrafast chirped optical waveform recorder using a time microscope A new ...

  13. Ultrafast chirped optical waveform recorder using a time microscope...

    Office of Scientific and Technical Information (OSTI)

    Data Explorer Search Results Ultrafast chirped optical waveform recorder using a time microscope Title: Ultrafast chirped optical waveform recorder using a time microscope A new ...

  14. Microscopic theory of quantum anomalous Hall effect in graphene...

    Office of Scientific and Technical Information (OSTI)

    Microscopic theory of quantum anomalous Hall effect in graphene Citation Details In-Document Search Title: Microscopic theory of quantum anomalous Hall effect in graphene Authors: ...

  15. Microscopic Description of Nuclear Fission: Fission Barrier Heights...

    Office of Scientific and Technical Information (OSTI)

    Conference: Microscopic Description of Nuclear Fission: Fission Barrier Heights of Even-Even Actinides Citation Details In-Document Search Title: Microscopic Description of Nuclear ...

  16. Microscopic Study Of Alpha + N Bremsstrahlung From Effective...

    Office of Scientific and Technical Information (OSTI)

    Microscopic Study Of Alpha + N Bremsstrahlung From Effective And Realistic Inter-Nucleon Interactions Citation Details In-Document Search Title: Microscopic Study Of Alpha + N ...

  17. Toward Understanding the Microscopic Origin of Nuclear Clustering...

    Office of Scientific and Technical Information (OSTI)

    Toward Understanding the Microscopic Origin of Nuclear Clustering Citation Details In-Document Search Title: Toward Understanding the Microscopic Origin of Nuclear Clustering Open...

  18. Atomic Chemistry in Turbulent Media I: Effect of Atomic Cooling...

    Office of Scientific and Technical Information (OSTI)

    Atomic Chemistry in Turbulent Media I: Effect of Atomic Cooling Citation Details In-Document Search Title: Atomic Chemistry in Turbulent Media I: Effect of Atomic Cooling Authors: ...

  19. Atom Trajectory Viewer

    Energy Science and Technology Software Center (OSTI)

    2015-12-28

    Atom Trajectory Viewer is a visualization tool developed to enable interactive exploration of atomic trajectories and corresponding statistics in molecular dynamics.

  20. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment A Microscopic Double-Slit Experiment Print Wednesday, 29 February 2012 00:00 Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using

  1. Miniature self-contained vacuum compatible electronic imaging microscope

    DOE Patents [OSTI]

    Naulleau, Patrick P.; Batson, Phillip J.; Denham, Paul E.; Jones, Michael S.

    2001-01-01

    A vacuum compatible CCD-based microscopic camera with an integrated illuminator. The camera can provide video or still feed from the microscope contained within a vacuum chamber. Activation of an optional integral illuminator can provide light to illuminate the microscope subject. The microscope camera comprises a housing with a objective port, modified objective, beam-splitter, CCD camera, and LED illuminator.

  2. Vertically aligned nanostructure scanning probe microscope tips

    DOE Patents [OSTI]

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  3. SLAC All Access: X-ray Microscope

    ScienceCinema (OSTI)

    Nelson, Johanna; Liu, Yijin

    2014-06-13

    SLAC physicists Johanna Nelson and Yijin Liu give a brief overview of the X-ray microscope at the Stanford Synchrotron Radiation Lightsource (SSRL) that is helping improve rechargeable-battery technology by letting researchers peek into the inner workings of batteries as they operate.

  4. Scanning magnetoresistance microscopy of atom chips

    SciTech Connect (OSTI)

    Volk, M.; Whitlock, S.; Wolff, C. H.; Hall, B. V.; Sidorov, A. I.

    2008-02-15

    Surface based geometries of microfabricated wires or patterned magnetic films can be used to magnetically trap and manipulate ultracold neutral atoms or Bose-Einstein condensates. We investigate the magnetic properties of such atom chips using a scanning magnetoresistive (MR) microscope with high spatial resolution and high field sensitivity. By comparing MR scans of a permanent magnetic atom chip to field profiles obtained using ultracold atoms, we show that MR sensors are ideally suited to observe small variations of the magnetic field caused by imperfections in the wires or magnetic materials which ultimately lead to fragmentation of ultracold atom clouds. Measurements are also provided for the magnetic field produced by a thin current-carrying wire with small geometric modulations along the edge. Comparisons of our measurements with a full numeric calculation of the current flow in the wire and the subsequent magnetic field show excellent agreement. Our results highlight the use of scanning MR microscopy as a convenient and powerful technique for precisely characterizing the magnetic fields produced near the surface of atom chips.

  5. Customized atomic force microscopy probe by focused-ion-beam...

    Office of Scientific and Technical Information (OSTI)

    Department of Pediatrics, Division of Immunology, Allergy and Rheumatology, Stanford ... OSTI Identifier: 22314503 Resource Type: Journal Article Resource Relation: Journal Name: ...

  6. Structure and Dynamics of Dinucleosomes Assessed by Atomic Force Microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Filenko, Nina A.; Palets, Dmytro B.; Lyubchenko, Yuri L.

    2012-01-01

    Dynamics of nucleosomes and their interactions are important for understanding the mechanism of chromatin assembly. Internucleosomal interaction is required for the formation of higher-order chromatin structures. Although H1 histone is critically involved in the process of chromatin assembly, direct internucleosomal interactions contribute to this process as well. To characterize the interactions of nucleosomes within the nucleosome array, we designed a dinucleosome and performed direct AFM imaging. The analysis of the AFM data showed dinucleosomes are very dynamic systems, enabling the nucleosomes to move in a broad range along the DNA template. Di-nucleosomes in close proximity were observed, but their populationmore » was low. The use of the zwitterionic detergent, CHAPS, increased the dynamic range of the di-nucleosome, facilitating the formation of tight di-nucleosomes. The role of CHAPS and similar natural products in chromatin structure and dynamics is also discussed.« less

  7. Mode synthesizing atomic force microscopy and mode-synthesizing sensing

    DOE Patents [OSTI]

    Passian, Ali; Thundat, Thomas George; Tetard, Laurene

    2013-05-17

    A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.

  8. Co-localised Raman and force spectroscopy reveal the roles of hydrogen bonds and π-π interactions in defining the mechanical properties of diphenylalanine nano- and micro-tubes

    SciTech Connect (OSTI)

    Sinjab, Faris; Bondakov, Georgi; Notingher, Ioan

    2014-06-23

    An integrated atomic force and polarized Raman microscope were used to measure the elastic properties of individual diphenylalanine (FF) nano- and micro-tubes and to obtain quantitative information regarding the inter-molecular interactions that define their mechanical properties. For individual tubes, co-localised force spectroscopy and Raman spectroscopy measurements allowed the calculation of the Young's and shear moduli (25 ± 5 GPa and 0.28 ± 0.05 GPa, respectively) and the contribution of hydrogen bonding network to the Young's modulus (∼17.6 GPa). The π-π interactions between the phenyl rings, dominated by T-type arrangements, were estimated based on previously published X-ray data to only 0.20 GPa. These results provide experimental evidence obtained from individual FF tubes that the network of H-bonds dominates the elastic properties of the FF tubes.

  9. Scanning tunneling microscope assembly, reactor, and system

    DOE Patents [OSTI]

    Tao, Feng; Salmeron, Miquel; Somorjai, Gabor A

    2014-11-18

    An embodiment of a scanning tunneling microscope (STM) reactor includes a pressure vessel, an STM assembly, and three spring coupling objects. The pressure vessel includes a sealable port, an interior, and an exterior. An embodiment of an STM system includes a vacuum chamber, an STM reactor, and three springs. The three springs couple the STM reactor to the vacuum chamber and are operable to suspend the scanning tunneling microscope reactor within the interior of the vacuum chamber during operation of the STM reactor. An embodiment of an STM assembly includes a coarse displacement arrangement, a piezoelectric fine displacement scanning tube coupled to the coarse displacement arrangement, and a receiver. The piezoelectric fine displacement scanning tube is coupled to the coarse displacement arrangement. The receiver is coupled to the piezoelectric scanning tube and is operable to receive a tip holder, and the tip holder is operable to receive a tip.

  10. Ultra high frequency imaging acoustic microscope

    DOE Patents [OSTI]

    Deason, Vance A.; Telschow, Kenneth L.

    2006-05-23

    An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

  11. Commissioning of the PRIOR proton microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Varentsov, D.; Antonov, O.; Bakhmutova, A.; Barnes, C. W.; Bogdanov, A.; Danly, C. R.; Efimov, S.; Endres, M.; Fertman, A.; Golubev, A. A.; et al

    2016-02-18

    Recently, a new high energy proton microscopy facility PRIOR (Proton Microscope for FAIR Facility for Anti-proton and Ion Research) has been designed, constructed, and successfully commissioned at GSI Helmholtzzentrum für Schwerionenforschung (Darmstadt, Germany). As a result of the experiments with 3.5–4.5 GeV proton beams delivered by the heavy ion synchrotron SIS-18 of GSI, 30 μm spatial and 10 ns temporal resolutions of the proton microscope have been demonstrated. A new pulsed power setup for studying properties of matter under extremes has been developed for the dynamic commissioning of the PRIOR facility. This study describes the PRIOR setup as well asmore » the results of the first static and dynamic protonradiography experiments performed at GSI.« less

  12. Interpretation of long-range interatomic force

    SciTech Connect (OSTI)

    Buldum, A.; Ciraci, S.; Fong, C.Y.; Nelson, J.S.

    1999-02-01

    Recent direct mechanical measurements of atomic force microscopy showed that the force between the silicon tip and the silicon sample is long range in the attractive region and its magnitude at maximum is relatively smaller. These features disagree with previous theoretical predictions based on the {ital ab initio} calculations. We investigated the nature of forces between a silicon tip and the silicon (111)-(2{times}1) surface by performing first-principles pseudopotential and classical molecular dynamics calculations and by calculating the van der Waals interaction. The first two methods give forces that are short range in nature. Fair agreement between the experiment and theory is obtained when the van der Waals interaction is included. The effect of the tip induced deformation is analyzed. {copyright} {ital 1999} {ital The American Physical Society}

  13. Protective Force Program Manual

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2000-06-30

    Provides detailed requirements to supplement DOE O 473.2, Protective Force Program, which establishes the requirements and responsibilities for management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Does not cancel other directives.

  14. Administering Work Force Discipline

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2015-05-14

    The order provides requirements and responsibilities for administering work force discipline and corrective actions. Supersedes DOE O 3750.1.

  15. Fluid force transducer

    DOE Patents [OSTI]

    Jendrzejczyk, Joseph A.

    1982-01-01

    An electrical fluid force transducer for measuring the magnitude and direction of fluid forces caused by lateral fluid flow, includes a movable sleeve which is deflectable in response to the movement of fluid, and a rod fixed to the sleeve to translate forces applied to the sleeve to strain gauges attached to the rod, the strain gauges being connected in a bridge circuit arrangement enabling generation of a signal output indicative of the magnitude and direction of the force applied to the sleeve.

  16. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun; Ogletree, D. Frank; Salmeron, Miguel; Xiao, Xudong

    1999-01-01

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  17. Method for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

    1999-03-09

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

  18. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, J.; Ogletree, D.F.; Salmeron, M.; Xiao, X.

    1998-04-28

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged. 9 figs.

  19. Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

    DOE Patents [OSTI]

    Hu, Jun; Ogletree, D. Frank; Salmeron, Miguel; Xiao, Xudong

    1998-01-01

    The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

  20. Atomizing nozzle and process

    DOE Patents [OSTI]

    Anderson, Iver E.; Figliola, Richard S.; Molnar, Holly M.

    1993-07-20

    High pressure atomizing nozzle includes a high pressure gas manifold having a divergent expansion chamber between a gas inlet and arcuate manifold segment to minimize standing shock wave patterns in the manifold and thereby improve filling of the manifold with high pressure gas for improved melt atomization. The atomizing nozzle is especially useful in atomizing rare earth-transition metal alloys to form fine powder particles wherein a majority of the powder particles exhibit particle sizes having near-optimum magnetic properties.

  1. Atomizing nozzle and process

    DOE Patents [OSTI]

    Anderson, Iver E.; Figliola, Richard S.; Molnar, Holly M.

    1992-06-30

    High pressure atomizing nozzle includes a high pressure gas manifold having a divergent expansion chamber between a gas inlet and arcuate manifold segment to minimize standing shock wave patterns in the manifold and thereby improve filling of the manifold with high pressure gas for improved melt atomization. The atomizing nozzle is especially useful in atomizing rare earth-transition metal alloys to form fine powder particles wherein a majority of the powder particles exhibit particle sizes having near-optimum magnetic properties.

  2. Atomic Energy Commission Takes Over Responsibility for all Atomic...

    National Nuclear Security Administration (NNSA)

    Takes Over Responsibility for all Atomic Energy Programs Atomic Energy Commission Takes Over Responsibility for all Atomic Energy Program Washington, DC In accordance with the ...

  3. Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Microscopic Theory of Fission Citation Details In-Document Search Title: Microscopic Theory of Fission You are accessing a document from the Department of Energy's (DOE) SciTech ...

  4. 3D Printed Microscope for Mobile Devices that Cost Pennies

    ScienceCinema (OSTI)

    Erikson, Rebecca; Baird, Cheryl; Hutchinson, Janine

    2015-06-23

    Scientists at PNNL have designed a 3D-printable microscope for mobile devices using pennies worth of plastic and glass materials. The microscope has a wide range of uses, from education to in-the-field science.

  5. 3D Printed Microscope for Mobile Devices that Cost Pennies

    SciTech Connect (OSTI)

    Erikson, Rebecca; Baird, Cheryl; Hutchinson, Janine

    2014-09-15

    Scientists at PNNL have designed a 3D-printable microscope for mobile devices using pennies worth of plastic and glass materials. The microscope has a wide range of uses, from education to in-the-field science.

  6. Superconducting qubit as a quantum transformer routing entanglement between a microscopic quantum memory and a macroscopic resonator

    SciTech Connect (OSTI)

    Kemp, Alexander; Saito, Shiro; Semba, Kouichi [NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya Atsugi-shi, Kanagawa 243-0198 (Japan); Munro, William J. [NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya Atsugi-shi, Kanagawa 243-0198 (Japan); National Institute of Informatics 2-1-2 Hitotsubashi, Chiyoda ku, Tokyo 101-8430 (Japan); Nemoto, Kae [National Institute of Informatics 2-1-2 Hitotsubashi, Chiyoda ku, Tokyo 101-8430 (Japan)

    2011-09-01

    We demonstrate experimentally the creation and measurement of an entangled state between a microscopic two-level system (TLS), formed by a defect in an oxide layer, and a macroscopic superconducting resonator, where their indirect interaction is mediated by an artificial atom, a superconducting persistent current qubit (PCQB). Under appropriate conditions, we found the coherence time of the TLS, the resonator, and the entangled state of these two are significantly longer than the Ramsey dephasing time of PCQB itself. This demonstrates that a PCQB can be used as a quantum transformer to address high coherence microscopic quantum memories by connecting them to macroscopic quantum buses.

  7. Microscopic silicon-based lateral high-aspect-ratio structures for thin film conformality analysis

    SciTech Connect (OSTI)

    Gao, Feng; Arpiainen, Sanna; Puurunen, Riikka L.

    2015-01-15

    Film conformality is one of the major drivers for the interest in atomic layer deposition (ALD) processes. This work presents new silicon-based microscopic lateral high-aspect-ratio (LHAR) test structures for the analysis of the conformality of thin films deposited by ALD and by other chemical vapor deposition means. The microscopic LHAR structures consist of a lateral cavity inside silicon with a roof supported by pillars. The cavity length (e.g., 20–5000 μm) and cavity height (e.g., 200–1000 nm) can be varied, giving aspect ratios of, e.g., 20:1 to 25 000:1. Film conformality can be analyzed with the microscopic LHAR by several means, as demonstrated for the ALD Al{sub 2}O{sub 3} and TiO{sub 2} processes from Me{sub 3}Al/H{sub 2}O and TiCl{sub 4}/H{sub 2}O. The microscopic LHAR test structures introduced in this work expose a new parameter space for thin film conformality investigations expected to prove useful in the development, tuning and modeling of ALD and other chemical vapor deposition processes.

  8. Scanning tip microwave near field microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Schultz, Peter G.; Wei, Tao

    1998-01-01

    A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

  9. Scanning tip microwave near field microscope

    DOE Patents [OSTI]

    Xiang, X.D.; Schultz, P.G.; Wei, T.

    1998-10-13

    A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an end wall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity. 17 figs.

  10. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  11. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  12. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  13. Acoustic microscope surface inspection system and method

    DOE Patents [OSTI]

    Khuri-Yakub, Butrus T.; Parent, Philippe; Reinholdtsen, Paul A.

    1991-01-01

    An acoustic microscope surface inspection system and method in which pulses of high frequency electrical energy are applied to a transducer which forms and focuses acoustic energy onto a selected location on the surface of an object and receives energy from the location and generates electrical pulses. The phase of the high frequency electrical signal pulses are stepped with respected to the phase of a reference signal at said location. An output signal is generated which is indicative of the surface of said selected location. The object is scanned to provide output signals representative of the surface at a plurality of surface locations.

  14. Acoustic microscope surface inspection system and method

    DOE Patents [OSTI]

    Khuri-Yakub, B.T.; Parent, P.; Reinholdtsen, P.A.

    1991-02-26

    An acoustic microscope surface inspection system and method are described in which pulses of high frequency electrical energy are applied to a transducer which forms and focuses acoustic energy onto a selected location on the surface of an object and receives energy from the location and generates electrical pulses. The phase of the high frequency electrical signal pulses are stepped with respect to the phase of a reference signal at said location. An output signal is generated which is indicative of the surface of said selected location. The object is scanned to provide output signals representative of the surface at a plurality of surface locations. 7 figures.

  15. Ponderomotive phase plate for transmission electron microscopes

    DOE Patents [OSTI]

    Reed, Bryan W. (Livermore, CA)

    2012-07-10

    A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.

  16. Atomic Sculpting with a Microscope | U.S. DOE Office of Science...

    Office of Science (SC) Website

    Resources Contact Information Basic Energy Sciences U.S. Department of Energy SC-22... The green background is an enlarged high resolution image of the letter "s", showing its ...

  17. Atomic Sculpting with a Microscope | U.S. DOE Office of Science...

    Office of Science (SC) Website

    Advanced Scientific Computing Research U.S. Department of Energy SC-21Germantown Building ... The green background is an enlarged high resolution image of the letter "s", showing its ...

  18. Continuum-kinetic-microscopic model of lung clearance due to core-annular fluid entrainment

    SciTech Connect (OSTI)

    Mitran, Sorin

    2013-07-01

    The human lung is protected against aspirated infectious and toxic agents by a thin liquid layer lining the interior of the airways. This airway surface liquid is a bilayer composed of a viscoelastic mucus layer supported by a fluid film known as the periciliary liquid. The viscoelastic behavior of the mucus layer is principally due to long-chain polymers known as mucins. The airway surface liquid is cleared from the lung by ciliary transport, surface tension gradients, and airflow shear forces. This work presents a multiscale model of the effect of airflow shear forces, as exerted by tidal breathing and cough, upon clearance. The composition of the mucus layer is complex and variable in time. To avoid the restrictions imposed by adopting a viscoelastic flow model of limited validity, a multiscale computational model is introduced in which the continuum-level properties of the airway surface liquid are determined by microscopic simulation of long-chain polymers. A bridge between microscopic and continuum levels is constructed through a kinetic-level probability density function describing polymer chain configurations. The overall multiscale framework is especially suited to biological problems due to the flexibility afforded in specifying microscopic constituents, and examining the effects of various constituents upon overall mucus transport at the continuum scale.

  19. Atomic Energy Commission : Atomic Power at Shippingport - 1958 Educational Film

    SciTech Connect (OSTI)

    2013-02-02

    The United States Atomic Energy Commission & Westinghouse Electric Company take us on a tour of an atomic power station.

  20. PARTICLE ACCELERATORS; 74 ATOMIC AND MOLECULAR PHYSICS; ATOMS...

    Office of Scientific and Technical Information (OSTI)

    74 ATOMIC AND MOLECULAR PHYSICS; ATOMS; ELECTRONS; HELIUM; LIGHT SOURCES; RADIATIONS; STORAGE RINGS; SYNCHROTRONS SYNCHROTRON RADIATION SYNCHROTRONLIGHT SOURCES QUANTUM CHAOS...

  1. Atomic Energy Commission : Atomic Power at Shippingport - 1958 Educational Film

    ScienceCinema (OSTI)

    None

    2014-07-31

    The United States Atomic Energy Commission & Westinghouse Electric Company take us on a tour of an atomic power station.

  2. Coulomb force as an entropic force

    SciTech Connect (OSTI)

    Wang Tower

    2010-05-15

    Motivated by Verlinde's theory of entropic gravity, we give a tentative explanation to the Coulomb's law with an entropic force. When trying to do this, we find the equipartition rule should be extended to charges and the concept of temperature should be reinterpreted. If one accepts the holographic principle as well as our generalizations and reinterpretations, then Coulomb's law, the Poisson equation, and the Maxwell equations can be derived smoothly. Our attempt can be regarded as a new way to unify the electromagnetic force with gravity, from the entropic origin. Possibly some of our postulates are related to the D-brane picture of black hole thermodynamics.

  3. Atomic Energy Commission Takes Over Responsibility for all Atomic Energy

    National Nuclear Security Administration (NNSA)

    Programs | National Nuclear Security Administration | (NNSA) Takes Over Responsibility for all Atomic Energy Programs Atomic Energy Commission Takes Over Responsibility for all Atomic Energy Program Washington, DC In accordance with the Atomic Energy Act of 1946, all atomic energy activities are transferred to the newly created Atomic Energy Commission

  4. Braking system for use with an arbor of a microscope

    DOE Patents [OSTI]

    Norgren, Duane U.

    1984-01-01

    A balanced braking system comprising a plurality of braking assemblies located about a member to be braked. Each of the braking assemblies consists of a spring biased piston of a first material fitted into a body of a different material which has a greater contraction upon cooling than the piston material. The piston is provided with a recessed head portion over which is positioned a diaphragm and forming a space therebetween to which is connected a pressurized fluid supply. The diaphragm is controlled by the fluid in the space to contact or withdraw from the member to be braked. A cooling device causes the body within which the piston is fitted to contract more than the piston, producing a tight shrink fit therebetween. The braking system is particularly applicable for selectively braking an arbor of an electron microscope which immobilizes, for example, a vertically adjustable low temperature specimen holder during observation. The system provides balanced braking forces which can be easily removed and re-established with minimal disturbance to arbor location.

  5. Hill Air Force Base

    Broader source: Energy.gov [DOE]

    Energy savings performance contracting at Hill Air Force Base generated much interest during a recent training session on energy management that downlinked 12 Department of Defense sites. Energy...

  6. The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory

    SciTech Connect (OSTI)

    Peterson, Randolph S.; Berggren, Karl K.; Mondol, Mark

    2011-06-01

    Few universities or colleges have an accelerator for use with advanced physics laboratories, but many of these institutions have a scanning electron microscope (SEM) on site, often in the biology department. As an accelerator for the undergraduate, advanced physics laboratory, the SEM is an excellent substitute for an ion accelerator. Although there are no nuclear physics experiments that can be performed with a typical 30 kV SEM, there is an opportunity for experimental work on accelerator physics, atomic physics, electron-solid interactions, and the basics of modern e-beam lithography.

  7. Metal atom oxidation laser

    DOE Patents [OSTI]

    Jensen, R.J.; Rice, W.W.; Beattie, W.H.

    1975-10-28

    A chemical laser which operates by formation of metal or carbon atoms and reaction of such atoms with a gaseous oxidizer in an optical resonant cavity is described. The lasing species are diatomic or polyatomic in nature and are readily produced by exchange or other abstraction reactions between the metal or carbon atoms and the oxidizer. The lasing molecules may be metal or carbon monohalides or monoxides. (auth)

  8. Metal atom oxidation laser

    DOE Patents [OSTI]

    Jensen, R.J.; Rice, W.W.; Beattie, W.H.

    1975-10-28

    A chemical laser which operates by formation of metal or carbon atoms and reaction of such atoms with a gaseous oxidizer in an optical resonant cavity is described. The lasing species are diatomic or polyatomic in nature and are readily produced by exchange or other abstraction reactions between the metal or carbon atoms and the oxidizer. The lasing molecules may be metal or carbon monohalides or monoxides.

  9. Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution

    SciTech Connect (OSTI)

    Akashi, Tetsuya; Takahashi, Yoshio; Tanigaki, Toshiaki Shimakura, Tomokazu; Kawasaki, Takeshi; Furutsu, Tadao; Shinada, Hiroyuki; Osakabe, Nobuyuki; Mller, Heiko; Haider, Maximilian; Tonomura, Akira

    2015-02-16

    Atomic-resolution electromagnetic field observation is critical to the development of advanced materials and to the unveiling of their fundamental physics. For this purpose, a spherical-aberration corrected 1.2-MV cold field-emission transmission electron microscope has been developed. The microscope has the following superior properties: stabilized accelerating voltage, minimized electrical and mechanical fluctuation, and coherent electron emission. These properties have enabled to obtain 43-pm information transfer. On the bases of these performances, a 43-pm resolution has been obtained by correcting lens aberrations up to the third order. Observations of GaN [411] thin crystal showed a projected atomic locations with a separation of 44?pm.

  10. Improved graphite furnace atomizer

    DOE Patents [OSTI]

    Siemer, D.D.

    1983-05-18

    A graphite furnace atomizer for use in graphite furnace atomic absorption spectroscopy is described wherein the heating elements are affixed near the optical path and away from the point of sample deposition, so that when the sample is volatilized the spectroscopic temperature at the optical path is at least that of the volatilization temperature, whereby analyteconcomitant complex formation is advantageously reduced. The atomizer may be elongated along its axis to increase the distance between the optical path and the sample deposition point. Also, the atomizer may be elongated along the axis of the optical path, whereby its analytical sensitivity is greatly increased.

  11. The Harnessed Atom

    Broader source: Energy.gov [DOE]

    The Harnessed Atom is a new middle school science, technology, engineering, and math (STEM) curriculum extension that focuses on nuclear science and energy. It offers teachers accurate, unbiased,...

  12. Microscopic origin of volume modulus inflation

    SciTech Connect (OSTI)

    Cicoli, Michele; Muia, Francesco; Pedro, Francisco Gil

    2015-12-21

    High-scale string inflationary models are in well-known tension with low-energy supersymmetry. A promising solution involves models where the inflaton is the volume of the extra dimensions so that the gravitino mass relaxes from large values during inflation to smaller values today. We describe a possible microscopic origin of the scalar potential of volume modulus inflation by exploiting non-perturbative effects, string loop and higher derivative perturbative corrections to the supergravity effective action together with contributions from anti-branes and charged hidden matter fields. We also analyse the relation between the size of the flux superpotential and the position of the late-time minimum and the inflection point around which inflation takes place. We perform a detailed study of the inflationary dynamics for a single modulus and a two moduli case where we also analyse the sensitivity of the cosmological observables on the choice of initial conditions.

  13. Long working distance incoherent interference microscope

    DOE Patents [OSTI]

    Sinclair, Michael B.; De Boer, Maarten P.

    2006-04-25

    A full-field imaging, long working distance, incoherent interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. A long working distance greater than 10 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-dimensional height profiles of MEMS test structures to be acquired across an entire wafer while being actively probed, and, optionally, through a transparent window. An optically identical pair of sample and reference arm objectives is not required, which reduces the overall system cost, and also the cost and time required to change sample magnifications. Using a LED source, high magnification (e.g., 50.times.) can be obtained having excellent image quality, straight fringes, and high fringe contrast.

  14. Three-dimensional scanning confocal laser microscope

    DOE Patents [OSTI]

    Anderson, R. Rox; Webb, Robert H.; Rajadhyaksha, Milind

    1999-01-01

    A confocal microscope for generating an image of a sample includes a first scanning element for scanning a light beam along a first axis, and a second scanning element for scanning the light beam at a predetermined amplitude along a second axis perpendicular to the first axis. A third scanning element scans the light beam at a predetermined amplitude along a third axis perpendicular to an imaging plane defined by the first and second axes. The second and third scanning element are synchronized to scan at the same frequency. The second and third predetermined amplitudes are percentages of their maximum amplitudes. A selector determines the second and third predetermined amplitudes such that the sum of the percentages is equal to one-hundred percent.

  15. Protective Force Program Manual

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2001-12-20

    Provides detailed requirements to supplement DOE O 473.2, PROTECTIVE FORCE PROGRAM, which establishes the requirements and responsibilities for management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Change 1 revised pages in Chapters IV and VI on 12/20/2001.

  16. Linear relationship between water wetting behavior and microscopic interactions of super-hydrophilic surfaces

    SciTech Connect (OSTI)

    Liu, Jian; Guo, Pan; University of Chinese Academy of Sciences, Beijing 100049 ; Wang, Chunlei; Shi, Guosheng Fang, Haiping

    2013-12-21

    Using molecular dynamics simulations, we show a fine linear relationship between surface energies and microscopic Lennard-Jones parameters of super-hydrophilic surfaces. The linear slope of the super-hydrophilic surfaces is consistent with the linear slope of the super-hydrophobic, hydrophobic, and hydrophilic surfaces where stable water droplets can stand, indicating that there is a universal linear behavior of the surface energies with the water-surface van der Waals interaction that extends from the super-hydrophobic to super-hydrophilic surfaces. Moreover, we find that the linear relationship exists for various substrate types, and the linear slopes of these different types of substrates are dependent on the surface atom density, i.e., higher surface atom densities correspond to larger linear slopes. These results enrich our understanding of water behavior on solid surfaces, especially the water wetting behaviors on uncharged super-hydrophilic metal surfaces.

  17. Dilution and resonance-enhanced repulsion in nonequilibrium fluctuation forces

    SciTech Connect (OSTI)

    Bimonte, Giuseppe [Dipartimento di Scienze Fisiche, Universita di Napoli Federico II, Complesso Universitario MSA, Via Cintia, I-80126 Napoli (Italy); INFN Sezione di Napoli, I-80126 Napoli (Italy); Emig, Thorsten [Laboratoire de Physique Theorique et Modeles Statistiques, CNRS UMR 8626, Bat. 100, Universite Paris-Sud, F-91405 Orsay cedex (France); Krueger, Matthias; Kardar, Mehran [Massachusetts Institute of Technology, Department of Physics, Cambridge, Massachusetts 02139 (United States)

    2011-10-15

    In equilibrium, forces induced by fluctuations of the electromagnetic field between electrically polarizable objects (microscopic or macroscopic) in vacuum are generically attractive. The force may, however, become repulsive for microscopic particles coupled to thermal baths with different temperatures. We demonstrate that this nonequilibrium repulsion can be realized also between macroscopic objects, as planar slabs, if they are kept at different temperatures. It is shown that repulsion can be enhanced by (i) tuning of material resonances in the thermal region and by (ii) reducing the dielectric contrast due to ''dilution''. This can lead to stable equilibrium positions. We discuss the realization of these effects for aerogels, yielding repulsion down to submicron distances at realistic porosities.

  18. OOTW Force Design Tools

    SciTech Connect (OSTI)

    Bell, R.E.; Hartley, D.S.III; Packard, S.L.

    1999-05-01

    This report documents refined requirements for tools to aid the process of force design in Operations Other Than War (OOTWs). It recommends actions for the creation of one tool and work on other tools relating to mission planning. It also identifies the governmental agencies and commands with interests in each tool, from whom should come the user advisory groups overseeing the respective tool development activities. The understanding of OOTWs and their analytical support requirements has matured to the point where action can be taken in three areas: force design, collaborative analysis, and impact analysis. While the nature of the action and the length of time before complete results can be expected depends on the area, in each case the action should begin immediately. Force design for OOTWs is not a technically difficult process. Like force design for combat operations, it is a process of matching the capabilities of forces against the specified and implied tasks of the operation, considering the constraints of logistics, transport and force availabilities. However, there is a critical difference that restricts the usefulness of combat force design tools for OOTWs: the combat tools are built to infer non-combat capability requirements from combat capability requirements and cannot reverse the direction of the inference, as is required for OOTWs. Recently, OOTWs have played a larger role in force assessment, system effectiveness and tradeoff analysis, and concept and doctrine development and analysis. In the first Quadrennial Defense Review (QDR), each of the Services created its own OOTW force design tool. Unfortunately, the tools address different parts of the problem and do not coordinate the use of competing capabilities. These tools satisfied the immediate requirements of the QDR, but do not provide a long-term cost-effective solution.

  19. Synchrotron radiation infrared microscopic study of non-bridging...

    Office of Scientific and Technical Information (OSTI)

    Title: Synchrotron radiation infrared microscopic study of non-bridging oxygen modes associated with laser-induced breakdown of fused silica Authors: Matthews, M J ; Carr, C W ; ...

  20. Microscopic description of fission dynamics: finite element method...

    Office of Scientific and Technical Information (OSTI)

    Title: Microscopic description of fission dynamics: finite element method resolution of ... This site is a product of DOE's Office of Scientific and Technical Information (OSTI) and ...

  1. Microscopic Study Of Alpha + N Bremsstrahlung From Effective...

    Office of Scientific and Technical Information (OSTI)

    Of Alpha + N Bremsstrahlung From Effective And Realistic Inter-Nucleon Interactions Citation Details In-Document Search Title: Microscopic Study Of Alpha + N Bremsstrahlung ...

  2. Chiral three-nucleon forces and pairing in nuclei

    SciTech Connect (OSTI)

    Lesinski, Thomas; Hebeler, K.; Duguet, Thomas C; Schwenk, Achim

    2012-01-01

    We present the first study of pairing in nuclei including three-nucleon forces. We perform systematic calculations of the odd-even mass staggering generated using a microscopic pairing interaction at first order in chiral low-momentum interactions. Significant repulsive contributions from the leading chiral three-nucleon forces are found. Two- and three-nucleon interactions combined account for approximately 70% of the experimental pairing gaps, which leaves room for self-energy and induced interaction effects that are expected to be overall attractive in nuclei.

  3. Solidification analysis of a centrifugal atomizer using the Al-32.7wt.% Cu alloy

    SciTech Connect (OSTI)

    Osborne, M.G.

    1998-02-23

    A centrifugal atomizer (spinning disk variety) was designed and constructed for the production of spherical metal powders, 100--1,000 microns in diameter in an inert atmosphere. Initial atomization experiments revealed the need for a better understanding of how the liquid metal was atomized and how the liquid droplets solidified. To investigate particle atomization, Ag was atomized in air and the process recorded on high-speed film. To investigate particle solidification, Al-32.7 wt.% Cu was atomized under inert atmosphere and the subsequent particles were examined microscopically to determine solidification structure and rate. This dissertation details the experimental procedures used in producing the Al-Cu eutectic alloy particles, examination of the particle microstructures, and determination of the solidification characteristics (e.g., solidification rate) of various phases. Finally, correlations are proposed between the operation of the centrifugal atomizer and the observed solidification spacings.

  4. Reduction-in-Force

    Broader source: Energy.gov [DOE]

    Reduction in force (RIF) is a set of regulations and procedures that are used to determine whether an employee keeps his or her present position, or whether the employee has a right to another...

  5. Protective Force Program

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1995-02-13

    To prescribe Department of Energy policy, responsibilities, and requirements for the management and operation of the Protective Force Program. Chg 1 dated 2-13-95. Cancels DOE O 5632.7 and DOE O 5632.8.

  6. Three-body forces

    SciTech Connect (OSTI)

    Nefkens, B.M.K.

    1986-10-15

    A review of current knowledge of three-body forces from experimental and theoretical standpoints is given. The 3-H and 3-He nuclei are discussed. Also, nucleon scattering from deuterium is discussed. (AIP)

  7. Federal Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2009-07-15

    This Manual establishes requirements for the management and operation of the Department of Energy (DOE) Federal protective forces (FPFs). Cancels DOE M 470.4-3, Chg 1. Canceled by DOE O 473.3.

  8. CNEEC - Atomic Layer Deposition Tutorial by Stacey Bent

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Layer Deposition

  9. Atomizing nozzle and method

    DOE Patents [OSTI]

    Ting, Jason (Ames, IA); Anderson, Iver E. (Ames, IA); Terpstra, Robert L. (Ames, IA)

    2000-03-16

    A high pressure close-coupled gas atomizing nozzle includes multiple discrete gas jet discharge orifices having aerodynamically designed convergent-divergent geometry with an first converging section communicated to a gas supply manifold and to a diverging section by a constricted throat section to increase atomizing gas velocity. The gas jet orifices are oriented at gas jet apex angle selected relative to the melt supply tip apex angle to establish a melt aspiration condition at the melt supply tip.

  10. Optical atomic magnetometer

    DOE Patents [OSTI]

    Budker, Dmitry; Higbie, James; Corsini, Eric P

    2013-11-19

    An optical atomic magnetometers is provided operating on the principles of nonlinear magneto-optical rotation. An atomic vapor is optically pumped using linearly polarized modulated light. The vapor is then probed using a non-modulated linearly polarized light beam. The resulting modulation in polarization angle of the probe light is detected and used in a feedback loop to induce self-oscillation at the resonant frequency.

  11. [Band electronic structures and crystal packing forces

    SciTech Connect (OSTI)

    Not Available

    1993-01-01

    We investigated the electronic and structural properties of low-dimensional materials and explored the structure-property correlations governing their physical properties. Progress was made on how to interpret the scanning tunneling microscopy and atomic force microscopy images of layered materials and on how to account for charge density wave instabilities in 2-D metals. Materials studied included transition metal chalcogenides, transition metal halides, organic conducting salts, Mo bronzes, A[sub 2]PdH[sub 2], fullerenes, squarate tetrahydrate polymers Fe, Cu(C[sub 4]O[sub 4])4[center dot]H[sub 2]O, BEDT salts, etc.

  12. General Atomics (GA) | Princeton Plasma Physics Lab

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    General Atomics (GA) Subscribe to RSS - General Atomics (GA) General Atomics Image: General Atomics (GA) The Scorpion's Strategy: "Catch and Subdue" Read more about The Scorpion's...

  13. The Harnessed Atom | Department of Energy

    Office of Environmental Management (EM)

    The Harnessed Atom The Harnessed Atom The Harnessed Atom The Harnessed Atom is a new middle school science, technology, engineering, and math (STEM) curriculum extension...

  14. Work Force Restructuring Activities

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Work Force Restructuring Activities December 10, 2008 Note: Current updates are in bold # Planned Site/Contractor HQ Approved Separations Status General * LM has finalized the compilation of contractor management team separation data for the end of FY07 actuals and end of FY08 and FY09 projections. LM has submitted to Congress the FY 2007 Annual Report on contractor work force restructuring activities. The report has been posted to the LM website. *LM conducted a DOE complex-wide data call to

  15. Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy

    DOE Patents [OSTI]

    Kazmerski, Lawrence L.

    1990-01-01

    A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

  16. Work Force Discipline

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    1983-03-23

    The order provides guidance and procedures and states responsibilities for maintaining work force discipline in DOE. Chg 1, dated 3-11-85; Chg 2, dated 1-6-86; Chg 3, dated 3-21-89; Chg 4, dated 8-2-90; Chg 5, dated 3-9-92; Chg 6, dated 8-21-92, cancels Chg 5.

  17. Protective Force Program

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2000-06-30

    Establishes policy, requirements, responsibilities, and authorities, for the management and operation of the Department of Energy (DOE) Protective Force (PF) Program. Extended until 7-7-06 by DOE N 251.64, dated 7-7-05 Cancels: DOE 5632.7A

  18. Direct Aerosol Forcing Uncertainty

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Mccomiskey, Allison

    2008-01-15

    Understanding sources of uncertainty in aerosol direct radiative forcing (DRF), the difference in a given radiative flux component with and without aerosol, is essential to quantifying changes in Earth's radiation budget. We examine the uncertainty in DRF due to measurement uncertainty in the quantities on which it depends: aerosol optical depth, single scattering albedo, asymmetry parameter, solar geometry, and surface albedo. Direct radiative forcing at the top of the atmosphere and at the surface as well as sensitivities, the changes in DRF in response to unit changes in individual aerosol or surface properties, are calculated at three locations representing distinct aerosol types and radiative environments. The uncertainty in DRF associated with a given property is computed as the product of the sensitivity and typical measurement uncertainty in the respective aerosol or surface property. Sensitivity and uncertainty values permit estimation of total uncertainty in calculated DRF and identification of properties that most limit accuracy in estimating forcing. Total uncertainties in modeled local diurnally averaged forcing range from 0.2 to 1.3 W m-2 (42 to 20%) depending on location (from tropical to polar sites), solar zenith angle, surface reflectance, aerosol type, and aerosol optical depth. The largest contributor to total uncertainty in DRF is usually single scattering albedo; however decreasing measurement uncertainties for any property would increase accuracy in DRF. Comparison of two radiative transfer models suggests the contribution of modeling error is small compared to the total uncertainty although comparable to uncertainty arising from some individual properties.

  19. Contractor Protective Force

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2008-11-05

    This Manual establishes requirements for the management and operation of the U.S. Department of Energy contractor protective forces. Cancels: DOE M 470.4-3 Chg 1, CRD (Attachment 2) only, except for Section C. Canceled by DOE O 473.3.

  20. Simultaneous specimen and stage cleaning device for analytical electron microscope

    DOE Patents [OSTI]

    Zaluzec, Nestor J.

    1996-01-01

    An improved method and apparatus are provided for cleaning both a specimen stage, a specimen and an interior of an analytical electron microscope (AEM). The apparatus for cleaning a specimen stage and specimen comprising a plasma chamber for containing a gas plasma and an air lock coupled to the plasma chamber for permitting passage of the specimen stage and specimen into the plasma chamber and maintaining an airtight chamber. The specimen stage and specimen are subjected to a reactive plasma gas that is either DC or RF excited. The apparatus can be mounted on the analytical electron microscope (AEM) for cleaning the interior of the microscope.

  1. Atomic vapor laser isotope separation

    SciTech Connect (OSTI)

    Stern, R.C.; Paisner, J.A.

    1986-08-15

    The atomic vapor laser isotope separation (AVLIS) process for the enrichment of uranium is evaluated. (AIP)

  2. Iowa Powder Atomization Technologies

    SciTech Connect (OSTI)

    2012-01-01

    The same atomization effect seen in a fuel injector is being applied to titanium metal resulting in fine titanium powders that are less than half the width of a human hair. Titanium melts above 3,000°F and is highly corrosive therefore requiring specialized containers. The liquid titanium is poured through an Ames Laboratory - USDOE patented tube which is intended to increase the energy efficiency of the atomization process, which has the ability to dramatically decrease the cost of fine titanium powders. This novel process could open markets for green manufacturing of titanium components from jet engines to biomedical implants.

  3. Iowa Powder Atomization Technologies

    ScienceCinema (OSTI)

    None

    2013-03-01

    The same atomization effect seen in a fuel injector is being applied to titanium metal resulting in fine titanium powders that are less than half the width of a human hair. Titanium melts above 3,000°F and is highly corrosive therefore requiring specialized containers. The liquid titanium is poured through an Ames Laboratory - USDOE patented tube which is intended to increase the energy efficiency of the atomization process, which has the ability to dramatically decrease the cost of fine titanium powders. This novel process could open markets for green manufacturing of titanium components from jet engines to biomedical implants.

  4. Fragment Yields Calculated in a Time-Dependent Microscopic Theory...

    Office of Scientific and Technical Information (OSTI)

    Fragment Yields Calculated in a Time-Dependent Microscopic Theory of Fission Citation ... Word Cloud More Like This Full Text preview image File size NAView Full Text View Full ...

  5. Long working-distance, incoherent light interference microscope...

    Office of Scientific and Technical Information (OSTI)

    Journal Article: Long working-distance, incoherent light interference microscope Citation ... OSTI Identifier: 973677 Report Number(s): SAND2005-3369J Journal ID: ISSN 0003-6935; ...

  6. Microscopic Calculation of Fission Fragment Energies for the...

    Office of Scientific and Technical Information (OSTI)

    for the 239Pu(nth,f) Reaction Citation Details In-Document Search Title: Microscopic Calculation of Fission Fragment Energies for the 239Pu(nth,f) Reaction We calculate the ...

  7. Influence of mechanical noise inside a scanning electron microscope

    SciTech Connect (OSTI)

    Gaudenzi de Faria, Marcelo; Haddab, Yassine Le Gorrec, Yann; Lutz, Philippe

    2015-04-15

    The scanning electron microscope is becoming a popular tool to perform tasks that require positioning, manipulation, characterization, and assembly of micro-components. However, some of these applications require a higher level of performance with respect to dynamics and precision of positioning. One limiting factor is the presence of unidentified noises and disturbances. This work aims to study the influence of mechanical disturbances generated by the environment and by the microscope, identifying how these can affect elements in the vacuum chamber. To achieve this objective, a dedicated setup, including a high-resolution vibrometer, was built inside the microscope. This work led to the identification and quantification of main disturbances and noise sources acting on a scanning electron microscope. Furthermore, the effects of external acoustic excitations were analysed. Potential applications of these results include noise compensation and real-time control for high accuracy tasks.

  8. The Use of Microscopes and Telescopes in IR Imaging (Conference...

    Office of Scientific and Technical Information (OSTI)

    working in a research environment, where applications can vary from week to week. ... In these cases, the thermographer must rely on an IR microscope for close-up work with a ...

  9. A microscopic theory of low energy fission: fragment properties

    Office of Scientific and Technical Information (OSTI)

    (Conference) | SciTech Connect Conference: A microscopic theory of low energy fission: fragment properties Citation Details In-Document Search Title: A microscopic theory of low energy fission: fragment properties Authors: Younes, W ; Gogny, D ; Schunck, N Publication Date: 2013-01-11 OSTI Identifier: 1062214 Report Number(s): LLNL-PROC-609985 DOE Contract Number: W-7405-ENG-48 Resource Type: Conference Resource Relation: Conference: Presented at: Fifth International Conference on Fission

  10. Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Microscopic Theory of Fission Citation Details In-Document Search Title: Microscopic Theory of Fission Authors: Younes, W ; Gogny, D Publication Date: 2008-01-03 OSTI Identifier: 924187 Report Number(s): LLNL-PROC-400347 DOE Contract Number: W-7405-ENG-48 Resource Type: Conference Resource Relation: Conference: Presented at: Compound Nuclear Reactions and Related Topics, Fish Camp, CA, United States, Oct 22 - Oct 26, 2007 Research Org: Lawrence Livermore National Laboratory (LLNL), Livermore, CA

  11. The Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Conference: The Microscopic Theory of Fission Citation Details In-Document Search Title: The Microscopic Theory of Fission Fission-fragment properties have been calculated for thermal neutron-induced fission on a {sup 239}Pu target, using constrained Hartree-Fock-Bogoliubov calculations with a finite-range effective interaction. A quantitative criterion based on the interaction energy between the nascent fragments is introduced to define the scission configurations. The validity of this

  12. INL Laboratory Scale Atomizer

    SciTech Connect (OSTI)

    C.R. Clark; G.C. Knighton; R.S. Fielding; N.P. Hallinan

    2010-01-01

    A laboratory scale atomizer has been built at the Idaho National Laboratory. This has proven useful for laboratory scale tests and has been used to fabricate fuel used in the RERTR miniplate experiments. This instrument evolved over time with various improvements being made ‘on the fly’ in a trial and error process.

  13. Atom chip apparatus for experiments with ultracold rubidium and potassium gases

    SciTech Connect (OSTI)

    Ivory, M. K.; Ziltz, A. R.; Fancher, C. T.; Pyle, A. J.; Sensharma, A.; Chase, B.; Field, J. P.; Garcia, A.; Aubin, S.; Jervis, D.

    2014-04-15

    We present a dual chamber atom chip apparatus for generating ultracold {sup 87}Rb and {sup 39}K atomic gases. The apparatus produces quasi-pure Bose-Einstein condensates of 10{sup 4} {sup 87}Rb atoms in an atom chip trap that features a dimple and good optical access. We have also demonstrated production of ultracold {sup 39}K and subsequent loading into the chip trap. We describe the details of the dual chamber vacuum system, the cooling lasers, the magnetic trap, the multicoil magnetic transport system, the atom chip, and two optical dipole traps. Due in part to the use of light-induced atom desorption, the laser cooling chamber features a sufficiently good vacuum to also support optical dipole trap-based experiments. The apparatus is well suited for studies of atom-surface forces, quantum pumping and transport experiments, atom interferometry, novel chip-based traps, and studies of one-dimensional many-body systems.

  14. Force Modulator System

    SciTech Connect (OSTI)

    Redmond Clark

    2009-04-30

    Many metal parts manufacturers use large metal presses to shape sheet metal into finished products like car body parts, jet wing and fuselage surfaces, etc. These metal presses take sheet metal and - with enormous force - reshape the metal into a fully formed part in a manner of seconds. Although highly efficient, the forces involved in forming metal parts also damage the press itself, limit the metals used in part production, slow press operations and, when not properly controlled, cause the manufacture of large volumes of defective metal parts. To date, the metal-forming industry has not been able to develop a metal-holding technology that allows full control of press forces during the part forming process. This is of particular importance in the automotive lightweighting efforts under way in the US automotive manufacturing marketplace. Metalforming Controls Technology Inc. (MC2) has developed a patented press control system called the Force Modulator that has the ability to control these press forces, allowing a breakthrough in stamping process control. The technology includes a series of hydraulic cylinders that provide controlled tonnage at all points in the forming process. At the same time, the unique cylinder design allows for the generation of very high levels of clamping forces (very high tonnages) in very small spaces; a requirement for forming medium and large panels out of HSS and AHSS. Successful production application of these systems testing at multiple stamping operations - including Ford and Chrysler - has validated the capabilities and economic benefits of the system. Although this technology has been adopted in a number of stamping operations, one of the primary barriers to faster adoption and application of this technology in HSS projects is system cost. The cost issue has surfaced because the systems currently in use are built for each individual die as a custom application, thus driving higher tooling costs. This project proposed to better

  15. Ultracold Atoms: How Quantum Field Theory Invaded Atomic Physics

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Ultracold Atoms: How Quantum Field Theory Invaded Atomic Physics Eric Braaten Ohio State University May 6, 2015 4:00 p.m. (coffee @ 3:30) The development of the technology for trapping atoms and cooling them to ultralow temperatures gave birth to a new subfield of atomic physics. It also led to the introduction of new theoretical methods into atomic physics, I n particular quantum field theory (QFT). Methods of QFT developed in high energy physics have proved to be very useful in ultracold atom

  16. TEXT Pro Force Training

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Basic Protective Force Training Program DOE/IG-0641 March 2004 * None of the 10 sites included instruction in rappelling even though it was part of the special response team core curriculum and continued to be offered by the Nonprolif- eration and National Security Institute; * Only one site conducted basic training on use of a shotgun, despite the fact that a num- ber of sites used the weapon for breaching exercises and other purposes; and, * Seven of the sites modified prescribed training

  17. ARMY SERVICE FORCES

    Office of Legacy Management (LM)

    ARMY SERVICE FORCES ' -, 1 MANHATTAN ENGINEER DISTRICT --t 4 IN "LPLI RC,' LR io EIDM CIS INTELLIGENCE AND SECURITY DIVISION CHICAGO BRANCH OFFICE i ., -,* - P. 0. Box 6770-A I ' 1 .' CHICAGO 80. ILLINOIS /lvb 15 February 1945 Subject: shipment Security Survey at &Uinckrodt Chemical Works. MEMORANDUM to the Officer in Charge. 1. The Mallinckrodt Chemical Works, St. Louis, Missouri, was contacted by the undersigned on 16 November 1944, for the purpose of -king an investigation to

  18. Particles and Forces

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Quarks, Gluons, and Co. Meet the Quirky Inhabitants of the Proton Saturday Morning Physics Saturday Morning Physics -- -- Texas A&M University Texas A&M University Dr. Rainer J. Fries February 21, 2009 Quarks, Gluons and Co. 2 Zooming in on the World around us Quarks, Gluons and Co. 3 Atoms Democritus, Greek philosopher ~ 400 B.C: "All matter is made up of very small indivisible elements" He called them 'atomos'. 19 th century chemistry confirms: there are only 92 different

  19. Lawrenciums ionization potential, atom by atom

    SciTech Connect (OSTI)

    Miller, Johanna L.

    2015-06-15

    Researchers in Japan have begun probing the atomic physics of elements that can be produced only in minute quantities.

  20. A microfabricated atomic clock

    SciTech Connect (OSTI)

    Knappe, Svenja; Shah, Vishal; Schwindt, Peter D.D.; Hollberg, Leo; Kitching, John; Liew, Li-Anne; Moreland, John

    2004-08-30

    Fabrication techniques usually applied to microelectromechanical systems (MEMS) are used to reduce the size and operating power of the core physics assembly of an atomic clock. With a volume of 9.5 mm{sup 3}, a fractional frequency instability of 2.5x10{sup -10} at 1 s of integration, and dissipating less than 75 mW of power, the device has the potential to bring atomically precise timing to hand-held, battery-operated devices. In addition, the design and fabrication process allows for wafer-level assembly of the structures, enabling low-cost mass-production of thousands of identical units with the same process sequence, and easy integration with other electronics.

  1. ATOMIC ENERGY COMMISSION

    Office of Legacy Management (LM)

    ' ATOMIC ENERGY COMMISSION Frank K. Pittman, Director, bivisioa of Waste &&gement and s- portation, Headquarters j CONTAMItUTED RX-AEC-OWNED OR LEASED FACILITIES' This memorandum responds to your TWX certain information on the above subject. the documentation necessary to answer your available due to the records disposal vailing at the time of release or From records that are available and from disc&ions with most familiar with the transfer operations, &have the current

  2. Miniature quartz resonator force transducer

    DOE Patents [OSTI]

    EerNisse, E.P.

    The invention relates to a piezoelectric quartz force transducer having the shape of a double-ended tuning fork.

  3. Miniature quartz resonator force transducer

    DOE Patents [OSTI]

    Eer Nisse, Errol P.

    1980-01-01

    The invention relates to a piezoelectric quartz force transducer having the shape of a double-ended tuning fork.

  4. Budget Atomization | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Budget Atomization Budget Atomization Howard Dickenson, Deputy Associate Administrator for Acquisition and Project Management presented on Budget Atomization from the NNSA perspective. Howard presented an overview of the NNSA budget structure and an example of LANL controls. Chris Johns, Director of the Budget Office, DOE Office of the CFO presented on Budget Atomization from the DOE perspective. Chris provided an overview of funding, provided examples, and demonstrated the effect on labs/sites.

  5. Force-Field Parameter Fitter

    Energy Science and Technology Software Center (OSTI)

    2015-05-27

    ParFit is a flexible and extendable framework and library of classes for fitting force-field parameters to data from high-level ab-initio calculations on the basis of deterministic and stochastic algorithms. Currently, the code is fitting MM3 and Merck force-field parameters but could easily extend to other force-field types.

  6. Atomizer with liquid spray quenching

    DOE Patents [OSTI]

    Anderson, I.E.; Osborne, M.G.; Terpstra, R.L.

    1998-04-14

    Method and apparatus are disclosed for making metallic powder particles wherein a metallic melt is atomized by a rotating disk or other atomizer at an atomizing location in a manner to form molten droplets moving in a direction away from said atomizing location. The atomized droplets pass through a series of thin liquid quenching sheets disposed in succession about the atomizing location with each successive quenching sheet being at an increasing distance from the atomizing location. The atomized droplets are incrementally cooled and optionally passivated as they pass through the series of liquid quenching sheets without distorting the atomized droplets from their generally spherical shape. The atomized, cooled droplets can be received in a chamber having a collection wall disposed outwardly of the series of liquid quenching sheets. A liquid quenchant can be flowed proximate the chamber wall to carry the cooled atomized droplets to a collection chamber where atomized powder particles and the liquid quenchant are separated such that the liquid quenchant can be recycled. 6 figs.

  7. Atomizer with liquid spray quenching

    DOE Patents [OSTI]

    Anderson, Iver E.; Osborne, Matthew G.; Terpstra, Robert L.

    1998-04-14

    Method and apparatus for making metallic powder particles wherein a metallic melt is atomized by a rotating disk or other atomizer at an atomizing location in a manner to form molten droplets moving in a direction away from said atomizing location. The atomized droplets pass through a series of thin liquid quenching sheets disposed in succession about the atomizing location with each successive quenching sheet being at an increasing distance from the atomizing location. The atomized droplets are incrementally cooled and optionally passivated as they pass through the series of liquid quenching sheets without distorting the atomized droplets from their generally spherical shape. The atomized, cooled droplets can be received in a chamber having a collection wall disposed outwardly of the series of liquid quenching sheets. A liquid quenchant can be flowed proximate the chamber wall to carry the cooled atomized droplets to a collection chamber where atomized powder particles and the liquid quenchant are separated such that the liquid quenchant can be recycled.

  8. Apparatus and methods for controlling electron microscope stages

    DOE Patents [OSTI]

    Duden, Thomas

    2015-08-11

    Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive control sphere based at least in part on the received crystal parameters and that is rotatable by a user to different sphere orientations is presented. The sphere includes a plurality of stage coordinates that correspond to a plurality of positions of the stage and a plurality of crystallographic pole coordinates that correspond to a plurality of polar orientations of the crystal sample. Movement of the sphere causes movement of the stage, wherein the stage coordinates move in conjunction with the crystallographic coordinates represented by pole positions so as to show a relationship between stage positions and the pole positions.

  9. Microscopic model of electric-field-noise heating in ion traps

    SciTech Connect (OSTI)

    Safavi-Naini, A.; Rabl, P.; Weck, P. F.; Sadeghpour, H. R.

    2011-08-15

    Motional heating of ions in microfabricated traps is one of the open challenges hindering experimental realizations of large-scale quantum processing devices. Recently, a series of measurements of the heating rates in surface-electrode ion traps characterized their frequency, distance, and temperature dependencies, but our understanding of the microscopic origin of this noise remains incomplete. In this work we develop a theoretical model for the electric field noise which is associated with a random distribution of adsorbed atoms on the trap electrode surface. By using first-principles calculations of the fluctuating dipole moments of the adsorbed atoms we evaluate the distance, frequency, and temperature dependence of the resulting electric field fluctuation spectrum. Our theory reproduces correctly the d{sup -4} dependence with distance of the ion from the electrode surface and calculates the noise spectrum beyond the standard scenario of two-level fluctuators by incorporating all the relevant vibrational states. Our model predicts a regime of 1/f noise which commences at roughly the frequency of the fundamental phonon transition rate and a thermally activated noise spectrum which for higher temperatures exhibits a crossover as a function of frequency.

  10. DOE - NNSA/NFO -- Atomic Testing Museum

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    National Atomic Testing Museum NNSANFO Language Options U.S. DOENNSA - Nevada Field Office NATIONAL ATOMIC TESTING MUSEUM Photograph of Atomic Testing Museum The Nevada Test Site ...

  11. Atomic data for fusion

    SciTech Connect (OSTI)

    Hunter, H.T.; Kirkpatrick, M.I.; Alvarez, I.; Cisneros, C.; Phaneuf, R.A.; Barnett, C.F.

    1990-07-01

    This report provides a handbook of recommended cross-section and rate-coefficient data for inelastic collisions between hydrogen, helium and lithium atoms, molecules and ions, and encompasses more than 400 different reactions of primary interest in fusion research. Published experimental and theoretical data have been collected and evaluated, and the recommended data are presented in tabular, graphical and parametrized form. Processes include excitation and spectral line emission, charge exchange, ionization, stripping, dissociation and particle interchange reactions. The range of collision energies is appropriate to applications in fusion-energy research.

  12. Normal Force and Drag Force in Magnetorheological Finishing

    SciTech Connect (OSTI)

    Miao, C.; Shafrir, S.N.; Lambropoulos, J.C.; Jacobs, S.D.

    2010-01-13

    The material removal in magnetorheological finishing (MRF) is known to be controlled by shear stress, tau, which equals drag force, Fd, divided by spot area, As. However, it is unclear how the normal force, Fn, affects the material removal in MRF and how the measured ratio of drag force to normal force Fd/Fn, equivalent to coefficient of friction, is related to material removal. This work studies, for the first time for MRF, the normal force and the measured ratio Fd/Fn as a function of material mechanical properties. Experimental data were obtained by taking spots on a variety of materials including optical glasses and hard ceramics with a spot-taking machine (STM). Drag force and normal force were measured with a dual load cell. Drag force decreases linearly with increasing material hardness. In contrast, normal force increases with hardness for glasses, saturating at high hardness values for ceramics. Volumetric removal rate decreases with normal force across all materials. The measured ratio Fd/Fn shows a strong negative linear correlation with material hardness. Hard materials exhibit a low coefficient of friction. The volumetric removal rate increases with the measured ratio Fd/Fn which is also correlated with shear stress, indicating that the measured ratio Fd/Fn is a useful measure of material removal in MRF.

  13. High-stability cryogenic scanning tunneling microscope based on a closed-cycle cryostat

    SciTech Connect (OSTI)

    Hackley, Jason D.; Kislitsyn, Dmitry A.; Beaman, Daniel K.; Nazin, George V.; Ulrich, Stefan

    2014-10-15

    We report on the design and operation of a cryogenic ultra-high vacuum (UHV) scanning tunneling microscope (STM) coupled to a closed-cycle cryostat (CCC). The STM is thermally linked to the CCC through helium exchange gas confined inside a volume enclosed by highly flexible rubber bellows. The STM is thus mechanically decoupled from the CCC, which results in a significant reduction of the mechanical noise transferred from the CCC to the STM. Noise analysis of the tunneling current shows current fluctuations up to 4% of the total current, which translates into tip-sample distance variations of up to 1.5 picometers. This noise level is sufficiently low for atomic-resolution imaging of a wide variety of surfaces. To demonstrate this, atomic-resolution images of Au(111) and NaCl(100)/Au(111) surfaces, as well as of carbon nanotubes deposited on Au(111), were obtained. Thermal drift analysis showed that under optimized conditions, the lateral stability of the STM scanner can be as low as 0.18 /h. Scanning Tunneling Spectroscopy measurements based on the lock-in technique were also carried out, and showed no detectable presence of noise from the closed-cycle cryostat. Using this cooling approach, temperatures as low as 16 K at the STM scanner have been achieved, with the complete cool-down of the system typically taking up to 12 h. These results demonstrate that the constructed CCC-coupled STM is a highly stable instrument capable of highly detailed spectroscopic investigations of materials and surfaces at the atomic scale.

  14. Laser excited confocal microscope fluorescence scanner and method

    DOE Patents [OSTI]

    Mathies, Richard A.; Peck, Konan

    1992-01-01

    A fluorescent scanner for scanning the fluorescence from a fluorescence labeled separated sample on a sample carrier including a confocal microscope for illuminating a predetermined volume of the sample carrier and/or receiving and processing fluorescence emissions from said volume to provide a display of the separated sample.

  15. Laser excited confocal microscope fluorescence scanner and method

    DOE Patents [OSTI]

    Mathies, R.A.; Peck, K.

    1992-02-25

    A fluorescent scanner is designed for scanning the fluorescence from a fluorescence labeled separated sample on a sample carrier. The scanner includes a confocal microscope for illuminating a predetermined volume of the sample carrier and/or receiving and processing fluorescence emissions from the volume to provide a display of the separated sample. 8 figs.

  16. Dynamic microscopic theory of fusion using DC-TDHF

    SciTech Connect (OSTI)

    Umar, A. S.; Oberacker, V. E.; Keser, R.; Maruhn, J. A.; Reinhard, P.-G.

    2012-10-20

    The density-constrained time-dependent Hartree-Fock (DC-TDHF) theory is a fully microscopic approach for calculating heavy-ion interaction potentials and fusion cross sections below and above the fusion barrier. We discuss recent applications of DC-TDHF method to fusion of light and heavy systems.

  17. Neutrinoless double beta decay in the microscopic interacting boson model

    SciTech Connect (OSTI)

    Iachello, F. [Center for Theoretical Physics, Sloane Physics Laboratory Yale University New Haven, CT 06520-8120 (United States)

    2009-11-09

    The results of a calculation of the nuclear matrix elements for neutrinoless double beta decay in the closure approximation in several nuclei within the framework of the microscopic interacting boson model (IBM-2) are presented and compared with those calculated in the shell model (SM) and quasiparticle random phase approximation (QRPA)

  18. Microscopic observations of palladium used for cold fusion

    SciTech Connect (OSTI)

    Matsumoto, T. )

    1991-05-01

    This paper examines the microscopic structures of palladium metals used for cold fusion experiments. Tiny spot defects suggesting cold fusion have been observed in grain boundaries as the Nattoh model predicts. The relationship between these defects and a series of neutron busts and an indirect loop of hydrogen chain reactions are discussed.

  19. Scanning Transmission X-ray Microscope Control Program

    Energy Science and Technology Software Center (OSTI)

    2005-08-05

    User Interface and control software or C++ to run on specifically equipped computer running Windows Operating Systems. Program performs specific control functions required to operate Interferometer controlled scanning transmission X-ray microscopes at ALS beamlines 532 and 11.0.2. Graphical user interface facilitates control, display images and spectra.

  20. Reflection soft X-ray microscope and method

    DOE Patents [OSTI]

    Suckewer, S.; Skinner, C.H.; Rosser, R.

    1993-01-05

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  1. Reflection soft X-ray microscope and method

    DOE Patents [OSTI]

    Suckewer, Szymon; Skinner, Charles H.; Rosser, Roy

    1993-01-01

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  2. Air Force Renewable Energy Programs

    Office of Energy Efficiency and Renewable Energy (EERE)

    Presentation covers Air Force Renewable Energy Programs and is given at the Spring 2011 Federal Utility Partnership Working Group (FUPWG) meeting.

  3. Force As A Momentum Current

    SciTech Connect (OSTI)

    Munera, Hector A.

    2010-07-28

    Advantages of a neo-Cartesian approach to classical mechanics are noted. If conservation of linear momentum is the fundamental principle, Newton's three laws become theorems. A minor paradox in static Newtonian mechanics is identified, and solved by reinterpreting force as a current of momentum. Contact force plays the role of a mere midwife in the exchange of momentum; however, force cannot be eliminated from physics because it provides the numerical value for momentum current. In this sense, in a neo-Cartesian formulation of mechanics the concept of force becomes strengthened rather than weakened.

  4. Continuous Forcing Data, Darwin, Australia

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Jakob, Christian

    2010-09-22

    Long term, large scale continuous forcing data set for three complete wet seasons (2004-2005, 2005-2006 and 2006-2007) in Darwin, Australia.

  5. Continuous Forcing Data, Darwin, Australia

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Jakob, Christian

    Long term, large scale continuous forcing data set for three complete wet seasons (2004-2005, 2005-2006 and 2006-2007) in Darwin, Australia.

  6. Army Energy Initiatives Task Force

    Broader source: Energy.gov [DOE]

    Presentation—given at the Fall 2011 Federal Utility Partnership Working Group (FUPWG) meeting—covers the Army Energy Initiatives Task Force.

  7. General Atomics | Open Energy Information

    Open Energy Info (EERE)

    Product: General Atomics offers research, development and consulting services to the nuclear industry, including nuclear energy production, manufacturing, defense and related...

  8. Atomic Scale Characterization of Compound Semiconductors Using Atom Probe Tomography

    SciTech Connect (OSTI)

    Gorman, B. P.; Norman, A. G.; Lawrence, D.; Prosa, T.; Guthrey, H.; Al-Jassim, M.

    2011-01-01

    Internal interfaces are critical in determining the performance of III-V multijunction solar cells. Studying these interfaces with atomic resolution using a combination of transmission electron microscopy (TEM), atom probe tomography (APT), and density functional calculations enables a more fundamental understanding of carrier dynamics in photovoltaic (PV) device structures. To achieve full atomic scale spatial and chemical resolution, data acquisition parameters in laser pulsed APT must be carefully studied to eliminate surface diffusion. Atom probe data with minimized group V ion clustering and expected stoichiometry can be achieved by adjusting laser pulse power, pulse repetition rate, and specimen preparation parameters such that heat flow away from the evaporating surface is maximized. Applying these improved analysis conditions to III-V based PV gives an atomic scale understanding of compositional and dopant profiles across interfaces and tunnel junctions and the initial stages of alloy clustering and dopant accumulation. Details on APT experimental methods and future in-situ instrumentation developments are illustrated.

  9. Nanomanipulation and nanofabrication with multi-probe STM: From individual atoms to nanowires

    SciTech Connect (OSTI)

    Qin, Shengyong; Kim, Tae Hwan; Wang, Zhouhang; Li, An-Ping

    2012-01-01

    The wide variety of nanoscale structures and devices demands novel tools for handling, assembly, and fabrication at nanoscopic positioning precision. The manipulation tools should allow for in situ characterization and testing of fundamental building blocks, such as nanotubes and nanowires, as they are built into functional devices. In this paper, a bottom-up technique for nanomanipulation and nanofabrication is reported by using a 4-probe scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM). The applications of this technique are demonstrated in a variety of nanosystems, from manipulating individual atoms to bending, cutting, breaking carbon nanofibers, and constructing nanodevices for electrical characterizations. The combination of the wide field of view of SEM, the atomic position resolution of STM, and the flexibility of multiple scanning probes is expected to be a valuable tool for rapid prototyping in the nanoscience and nanotechnology.

  10. Alternative method to control radiative vortex forces in a magneto-optical trap

    SciTech Connect (OSTI)

    Kiersnowski, K.; Kawalec, T.; Dohnalik, T.

    2006-06-15

    We present an experimental and theoretical study of controlling the atomic spatial distributions in a magneto-optical trap (MOT). With a diaphragm we can vary the waist and power of one of the cooling laser beams and we can change parameters of large-diameter, parallelogram-shaped atomic orbits. We show that the radiative force generated by the repumping MOT laser has to be taken into consideration. Computer simulations of atomic trajectories explain the observed spatial structures, and we employ these simulations to present potential applications of controlling the diaphragm diameter as a function of time. A potential use of controlled vortex forces seems to have a great significance in recently presented important new methods to investigate cold atom collisions in the MOT, which were recently published.

  11. Characterization of patinas by means of microscopic techniques

    SciTech Connect (OSTI)

    Vazquez-Calvo, C.

    2007-11-15

    Many stone-made historic buildings have a yellowish layer called 'patina' on their external surface. In some cases, it is due to the natural ageing of the stone caused by chemical-physical reactions between the surface of the stone and the environment, and in other cases it is the result of biological activity. The origin of these patinas can be also be due to ancient protective treatments. The use of organic additives, such as protein-based compounds, in lime or gypsum-based patinas is a traditional technique, which has been used in past centuries for the conservation and protection of stone materials. The thinness of the patinas ensures that microscopic techniques are irreplaceable for their analysis. Optical Microscopy, Fluorescence Microscopy, Scanning Electron Microscopy together with an Energy Dispersive X-ray Spectrometer, and Electron Microprobe are the microscopic techniques used for the characterization of these coverings, providing very useful information on their composition, texture and structure.

  12. The Atomic City / The Magic of the Atom - 1950's Atomic Energy Commission Documentary

    ScienceCinema (OSTI)

    None

    2014-07-31

    The story of American cities located near atomic power plants, and steps taken monitoring radiation to ensure the safety of the public who live nearby. .

  13. The Atomic City / The Magic of the Atom - 1950's Atomic Energy Commission Documentary

    SciTech Connect (OSTI)

    2012-06-04

    The story of American cities located near atomic power plants, and steps taken monitoring radiation to ensure the safety of the public who live nearby. .

  14. Atomic configuration of irradiation-induced planar defects in 3C-SiC

    SciTech Connect (OSTI)

    Lin, Y. R. [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); National Synchrotron Radiation Center, 101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu 30076, Taiwan (China); Ho, C. Y. [Institute of Nuclear Engineering and Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Hsieh, C. Y.; Chang, M. T.; Lo, S. C. [Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, Taiwan (China); Chen, F. R. [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Kai, J. J., E-mail: ceer0001@gmail.com [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Institute of Nuclear Engineering and Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China)

    2014-03-24

    The atomic configuration of irradiation-induced planar defects in single crystal 3C-SiC at high irradiation temperatures was shown in this research. A spherical aberration corrected scanning transmission electron microscope provided images of individual silicon and carbon atoms by the annular bright-field (ABF) method. Two types of irradiation-induced planar defects were observed in the ABF images including the extrinsic stacking fault loop with two offset Si-C bilayers and the intrinsic stacking fault loop with one offset Si-C bilayer. The results are in good agreement with images simulated under identical conditions.

  15. Scanning Tunneling Microscope Data Acquistion and Control System

    Energy Science and Technology Software Center (OSTI)

    1995-02-01

    SHOESCAN is a PC based code that acquires and displays data for Scanning Tunneling Microscopes (STM). SHOESCAN interfaces with the STM through external electronic feedback and raster control circuits that are controlled by I/O boards on the PC bus. Data is displayed on a separate color monitor that is interfaced to the PC through an additional frame-grabber board. SHOESCAN can acquire a wide range of surface topographic information as well as surface electronic structure information.

  16. Low vibration high numerical aperture automated variable temperature Raman microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Tian, Y.; Reijnders, A. A.; Osterhoudt, G. B.; Valmianski, I.; Ramirez, J. G.; Urban, C.; Zhong, R.; Schneeloch, J.; Gu, G.; Henslee, I.; et al

    2016-04-05

    Raman micro-spectroscopy is well suited for studying a variety of properties and has been applied to wide- ranging areas. Combined with tuneable temperature, Raman spectra can offer even more insights into the properties of materials. However, previous designs of variable temperature Raman microscopes have made it extremely challenging to measure samples with low signal levels due to thermal and positional instability as well as low collection efficiencies. Thus, contemporary Raman microscope has found limited applicability to probing the subtle physics involved in phase transitions and hysteresis. This paper describes a new design of a closed-cycle, Raman microscope with full polarizationmore » rotation. High collection efficiency, thermal and mechanical stability are ensured by both deliberate optical, cryogenic, and mechanical design. Measurements on two samples, Bi2Se3 and V2O3, which are known as challenging due to low thermal conductivities, low signal levels and/or hysteretic effects, are measured with previously undemonstrated temperature resolution.« less

  17. Microscopic Theory of Nuclear Fission: Recent Highlights | Argonne...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    world, a predictive theory of fission should instead be based solely on quantum many-body methods and our best knowledge of nuclear forces. Today, there is a consensus that...

  18. In-situ control system for atomization

    DOE Patents [OSTI]

    Anderson, I.E.; Figliola, R.S.; Terpstra, R.L.

    1995-06-13

    Melt atomizing apparatus comprising a melt supply orifice for supplying the melt for atomization and gas supply orifices proximate the melt supply orifice for supplying atomizing gas to atomize the melt as an atomization spray is disclosed. The apparatus includes a sensor, such as an optical and/or audio sensor, for providing atomization spray data, and a control unit responsive to the sensed atomization spray data for controlling at least one of the atomizing gas pressure and an actuator to adjust the relative position of the gas supply orifice and melt supply in a manner to achieve a desired atomization spray. 3 figs.

  19. In-situ control system for atomization

    DOE Patents [OSTI]

    Anderson, Iver E.; Figliola, Richard S.; Terpstra, Robert L.

    1995-06-13

    Melt atomizing apparatus comprising a melt supply orifice for supplying the melt for atomization and gas supply orifices proximate the melt supply orifice for supplying atomizing gas to atomize the melt as an atomization spray. The apparatus includes a sensor, such as an optical and/or audio sensor, for providing atomization spray data, and a control unit responsive to the sensed atomization spray data for controlling at least one of the atomizing gas pressure and an actuator to adjust the relative position of the gas supply orifice and melt supply in a manner to achieve a desired atomization spray.

  20. Supersonic coal water slurry fuel atomizer

    DOE Patents [OSTI]

    Becker, Frederick E.; Smolensky, Leo A.; Balsavich, John

    1991-01-01

    A supersonic coal water slurry atomizer utilizing supersonic gas velocities to atomize coal water slurry is provided wherein atomization occurs externally of the atomizer. The atomizer has a central tube defining a coal water slurry passageway surrounded by an annular sleeve defining an annular passageway for gas. A converging/diverging section is provided for accelerating gas in the annular passageway to supersonic velocities.

  1. Atomic charges for modeling metal–organic frameworks: Why and how

    SciTech Connect (OSTI)

    Hamad, Said Balestra, Salvador R.G.; Bueno-Perez, Rocio; Calero, Sofia; Ruiz-Salvador, A. Rabdel

    2015-03-15

    Atomic partial charges are parameters of key importance in the simulation of Metal–Organic Frameworks (MOFs), since Coulombic interactions decrease with the distance more slowly than van der Waals interactions. But despite its relevance, there is no method to unambiguously assign charges to each atom, since atomic charges are not quantum observables. There are several methods that allow the calculation of atomic charges, most of them starting from the electronic wavefunction or the electronic density or the system, as obtained with quantum mechanics calculations. In this work, we describe the most common methods employed to calculate atomic charges in MOFs. In order to show the influence that even small variations of structure have on atomic charges, we present the results that we obtained for DMOF-1. We also discuss the effect that small variations of atomic charges have on the predicted structural properties of IRMOF-1. - Graphical abstract: We review the different method with which to calculate atomic partial charges that can be used in force field-based calculations. We also present two examples that illustrate the influence of the geometry on the calculated charges and the influence of the charges on structural properties. - Highlights: • The choice of atomic charges is crucial in modeling adsorption and diffusion in MOFs. • Methods for calculating atomic charges in MOFs are reviewed. • We discuss the influence of the framework geometry on the calculated charges. • We discuss the influence of the framework charges on structural the properties.

  2. Dynamic force spectroscopy of parallel individual mucin1-antibody bonds

    SciTech Connect (OSTI)

    Sulchek, T A; Friddle, R W; Langry, K; Lau, E; Albrecht, H; Ratto, T; DeNardo, S; Colvin, M E; Noy, A

    2005-05-02

    We used atomic force microscopy (AFM) to measure the binding forces between Mucin1 (MUC1) peptide and a single chain antibody fragment (scFv) selected from a scFv library screened against MUC1. This binding interaction is central to the design of the molecules for targeted delivery of radioimmunotherapeutic agents for prostate and breast cancer treatment. Our experiments separated the specific binding interaction from non-specific interactions by tethering the antibody and MUC1 molecules to the AFM tip and sample surface with flexible polymer spacers. Rupture force magnitude and elastic characteristics of the spacers allowed identification of the bond rupture events corresponding to different number of interacting proteins. We used dynamic force spectroscopy to estimate the intermolecular potential widths and equivalent thermodynamic off rates for mono-, bi-, and tri-valent interactions. Measured interaction potential parameters agree with the results of molecular docking simulation. Our results demonstrate that an increase of the interaction valency leads to a precipitous decline in the dissociation rate. Binding forces measured for mono and multivalent interactions match the predictions of a Markovian model for the strength of multiple uncorrelated bonds in parallel configuration. Our approach is promising for comparison of the specific effects of molecular modifications as well as for determination of the best configuration of antibody-based multivalent targeting agents.

  3. Los Alamos National Laboratory ATOMIC PHOTOGRAPHY ATOMIC PHOTOGRAPHY

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ATOMIC PHOTOGRAPHY ATOMIC PHOTOGRAPHY BLASTS FROM THE PAST BLASTS FROM THE PAST Twenty-five U.S. atmospheric nuclear weapons operations (each a series of tests) were conducted from 1945 to 1963, primarily at the Pacific Proving Grounds and at the Nevada Test Site, southeastern Nevada. Below, observers witness Operation Greenhouse, Eniwetok Atoll, spring 1951. Greenhouse was a series of four tests. 17 Proof of principle for thermonuclear weapons, the 225-kiloton George test, May 8, 1951, of

  4. Near-Field Magneto-Optical Microscope (Patent) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Publication: United States Language: English Subject: 47 OTHER INSTRUMENTATION; FIBER OPTICS; MAGNETIC FIELDS; MICROSCOPES; POLARIZATION; RESOLUTION; DESIGN; OPERATION Word Cloud...

  5. Training program to prepare the U.S. DOE laboratories for the entry into force of the protocol additional to the agreement between the United States of America and the International Atomic Energy Agency for the application of safeguards in the United

    SciTech Connect (OSTI)

    Boyer, Brian David; Stevens, Rebecca C; Uribe, Eva C; Sandoval, M Analisa; Valente, John N; Valente, John U; Jo, Jae H; Sellen, Joana

    2009-01-01

    In 2008, a joint team from Brookhaven National Laboratory (BNL) and Los Alamos National Laboratory (LANL) consisting of specialists in training IAEA inspectors in the use of complementary access activities formulated a training program to prepare the U.S DOE laboratories for the entry into force of the U.S. Additional Protocol. Since the U.S. Additional Protocol would allow for IAEA access to the DOE laboratories under the aegis of complementary access activities, the DOE laboratories would need to prepare for such visits. The goal of the training was to ensure that the DOE laboratories would successfully host an IAEA complementary access. In doing so, the labs must be able to provide the IAEA with the information that the IAEA would need to resolve its questions about the U.S. Declaration and declared activities at the lab, and also protect certain equities, as provided under the U.S. Additional Protocol Article 1.b and c. which set forth a 'National Security Exclusion.' This 'NSE' states that the AP provisions apply within the United States 'excluding only instances where its application would result in access by the Agency to activities with direct national security significance to the United States or to location or information associated with such activities.' These activities are referred to collectively as DNSS-direct national security significance. Furthermore, the U.S. has a specific right to employ managed access, without prejudice to the right under Article 1.b, in connection with activities of DNSS. The provisions in Articles 1.b and 1.c are unique to the U.S. AP, and are additional to the more general right, under Article 7, to use managed access to protect from disclosure proprietary and/or proliferation-sensitive information, and to meet safety and security requirements, that is incorporated directly from the Model Additional Protocol. The BNL-LANL team performed training at Lawrence Livermore National Laboratory, Idaho National Laboratory, and Oak

  6. Microscopic analysis of order parameters in nuclear quantum phase transitions

    SciTech Connect (OSTI)

    Li, Z. P.; Niksic, T.; Vretenar, D.; Meng, J.

    2009-12-15

    Microscopic signatures of nuclear ground-state shape phase transitions in Nd isotopes are studied using excitation spectra and collective wave functions obtained by diagonalization of a five-dimensional Hamiltonian for quadrupole vibrational and rotational degrees of freedom, with parameters determined by constrained self-consistent relativistic mean-field calculations for triaxial shapes. As a function of the physical control parameter, the number of nucleons, energy gaps between the ground state and the excited vibrational states with zero angular momentum, isomer shifts, and monopole transition strengths exhibit sharp discontinuities at neutron number N=90, which is characteristic of a first-order quantum phase transition.

  7. Concurrent in situ ion irradiation transmission electron microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Hattar, K.; Bufford, D. C.; Buller, D. L.

    2014-08-29

    An in situ ion irradiation transmission electron microscope has been developed and is operational at Sandia National Laboratories. This facility permits high spatial resolution, real time observation of electron transparent samples under ion irradiation, implantation, mechanical loading, corrosive environments, and combinations thereof. This includes the simultaneous implantation of low-energy gas ions (0.8–30 keV) during high-energy heavy ion irradiation (0.8–48 MeV). In addition, initial results in polycrystalline gold foils are provided to demonstrate the range of capabilities.

  8. Propagation of nonlinearly generated harmonic spin waves in microscopic stripes

    SciTech Connect (OSTI)

    Rousseau, O.; Yamada, M.; Miura, K.; Ogawa, S.; Otani, Y.

    2014-02-07

    We report on the experimental study of the propagation of nonlinearly generated harmonic spin waves in microscopic CoFeB stripes. Using an all electrical technique with coplanar waveguides, we find that two kinds of spin waves can be generated by nonlinear frequency multiplication. One has a non-uniform spatial geometry and thus requires appropriate detector geometry to be identified. The other corresponds to the resonant fundamental propagative spin waves and can be efficiently excited by double- or triple-frequency harmonics with any geometry. Nonlinear excited spin waves are particularly efficient in providing an electrical signal arising from spin wave propagation.

  9. Nature's Microscopic Masonry: Sucking in toxins, spitting out products

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Nature's Microscopic Masonry: Sucking in toxins, spitting out products Click to share on Facebook (Opens in new window) Click to share on Twitter (Opens in new window) Click to share on Reddit (Opens in new window) Click to share on Pinterest (Opens in new window) Scientists have for the first time viewed how bacterial proteins self-assemble into thin sheets and begin to form the walls of the outer shell for nano-sized polyhedral compartments that function as specialized factories. This research

  10. ATOMIC ENERGY ACT OF 1946

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    D. Niisc AEC Hcadqoartcrs Library Voliiinc I Principal Docriiiiciits U.S. ATOMIC ENERGY COMMISSION WASHINGTON, 1965 PUBLIC LAW 5 8 5 - 7 9 CONQRESS CHAPTER 724-2 ...

  11. Imaging atoms in 3-D

    ScienceCinema (OSTI)

    Ercius, Peter

    2014-06-27

    Berkeley Lab's Peter Ercius discusses "Imaging atoms in 3-D" in this Oct. 28, 2013 talk, which is part of a Science at the Theater event entitled Eight Big Ideas

  12. Efimov physics in cold atoms

    SciTech Connect (OSTI)

    Braaten, Eric . E-mail: braaten@mps.ohio-state.edu; Hammer, H.-W. . E-mail: hammer@itkp.uni-bonn.de

    2007-01-15

    Atoms with a large scattering length have universal low-energy properties that do not depend on the details of their structure or their interactions at short distances. In the 2-atom sector, the universal properties are familiar and depend only on the scattering length. In the 3-atom sector for identical bosons, the universal properties include the existence of a sequence of shallow triatomic molecules called Efimov trimers and log-periodic dependence of scattering observables on the energy and the scattering length. In this review, we summarize the universal results that are currently known. We also summarize the experimental information that is currently available with an emphasis on 3-atom loss processes.

  13. Theoretical studies of atomic transitions

    SciTech Connect (OSTI)

    Fischer, C.F.

    1990-10-01

    This paper discusses: lifetime of excited states; core-polarization studies; large relativistic calculations; Monte Carlo Hartree-Fock (MCHF) atomic structure package; and MCHF codes for the hypercube. (LSP)

  14. UNITED STATES ATOMIC ENERGY COMMISSION

    Office of Legacy Management (LM)

    I(S.0 -01: SPECIAL NUCLEAR MATERIAL LlCEWSE Pursuant to the Atomic Energy Act of 1954 and Title 10, Code of Federal Regulations, Chapter 1, Part 70, "Special Nuclear Material ...

  15. u. S. Atomic Energy Commission

    Office of Legacy Management (LM)

    S. Atomic Energy Commission R. 0. Box 30, Ansonia Station New York ES, N. Y. MATERIALS 5+k& hJf Reference: SK:BL Attention: Mr. R. J. Smith Jr. Director Special Materials Division ...

  16. Nonlocal microscopic theory of quantum friction between parallel metallic slabs

    SciTech Connect (OSTI)

    Despoja, Vito

    2011-05-15

    We present a new derivation of the friction force between two metallic slabs moving with constant relative parallel velocity, based on T=0 quantum-field theory formalism. By including a fully nonlocal description of dynamically screened electron fluctuations in the slab, and avoiding the usual matching-condition procedure, we generalize previous expressions for the friction force, to which our results reduce in the local limit. Analyzing the friction force calculated in the two local models and in the nonlocal theory, we show that for physically relevant velocities local theories using the plasmon and Drude models of dielectric response are inappropriate to describe friction, which is due to excitation of low-energy electron-hole pairs, which are properly included in nonlocal theory. We also show that inclusion of dissipation in the nonlocal electronic response has negligible influence on friction.

  17. Atomic vapor laser isotope separation process

    DOE Patents [OSTI]

    Wyeth, Richard W.; Paisner, Jeffrey A.; Story, Thomas

    1990-01-01

    A laser spectroscopy system is utilized in an atomic vapor laser isotope separation process. The system determines spectral components of an atomic vapor utilizing a laser heterodyne technique.

  18. Fundamental Electroweak Studies using Trapped Ions & Atoms

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    collaboration performs fundamental electroweak studies on trapped ions & atoms. We use neutral atom and ion trapping techniques at radioactive ion beam facilities here and...

  19. Manhattan Project: Atomic Discoveries, 1890s-1939

    Office of Scientific and Technical Information (OSTI)

    The exact nature of these atoms remained elusive, however, despite centuries of attempts ... Explorations into the nature of the atom from 1919 to 1932 confirmed this new model, ...

  20. Atomic Photography: Blasts from the Past

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Photography National Security Science Latest Issue:July 2015 past issues All Issues submit Atomic Photography: Blasts from the Past A gallery of images reveals the weird...

  1. Initial validation of FORCE2

    SciTech Connect (OSTI)

    Burge, S.W.

    1991-06-01

    Erosion has been identified as one of the significant design issues in fluid beds. A cooperative R&D venture of industry, research, and government organizations was recently formed to meet the industry need for a better understanding of erosion in fluid beds. Research focussed on bed hydrodynamics, which are considered to be the primary erosion mechanism. As part of this work, ANL developed an analytical model (FLUFIX) for bed hydrodynamics. Partial validation was performed using data from experiments sponsored by the research consortium. Development of a three-dimensional fluid bed hydrodynamic model was part of Asea-Babcock`s in-kind contribution to the R&D venture. This model, FORCE2, was developed by Babcock & Wilcox`s Research and Development Division existing B&W program and on the gas-solids modeling and was based on an existing B&W program and on the gas-solids modeling technology developed by ANL and others. FORCE2 contains many of the features needed to model plant size beds and, therefore can be used along with the erosion technology to assess metal wastage in industrial equipment. As part of the development efforts, FORCE2 was partially validated using ANL`s two-dimensional model, FLUFIX, and experimental data. Time constraints as well as the lack of good hydrodynamic data, particularly at the plant scale, prohibited a complete validation of FORCE2. This report describes this initial validation of FORCE2.

  2. Atomic Resolution Imaging and Quantification of Chemical Functionality of Surfaces

    SciTech Connect (OSTI)

    Schwarz, Udo

    2014-12-10

    The work carried out from 2006-2014 under DoE support was targeted at developing new approaches to the atomic-scale characterization of surfaces that include species-selective imaging and an ability to quantify chemical surface interactions with site-specific accuracy. The newly established methods were subsequently applied to gain insight into the local chemical interactions that govern the catalytic properties of model catalysts of interest to DoE. The foundation of our work was the development of three-dimensional atomic force microscopy (3D-AFM), a new measurement mode that allows the mapping of the complete surface force and energy fields with picometer resolution in space (x, y, and z) and piconewton/millielectron volts in force/energy. From this experimental platform, we further expanded by adding the simultaneous recording of tunneling current (3D-AFM/STM) using chemically well-defined tips. Through comparison with simulations, we were able to achieve precise quantification and assignment of local chemical interactions to exact positions within the lattice. During the course of the project, the novel techniques were applied to surface-oxidized copper, titanium dioxide, and silicon oxide. On these materials, defect-induced changes to the chemical surface reactivity and electronic charge density were characterized with site-specific accuracy.

  3. DOE Contractor Work Force Restructuring Approval Thresholds

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Contractor Work Force Restructuring Approval Thresholds Up to 100 employees Contractor can ... to provide approval for NNSA work force restructurings in consultation with LM 501 ...

  4. Intermodulation electrostatic force microscopy for imaging surface photo-voltage

    SciTech Connect (OSTI)

    Borgani, Riccardo Forchheimer, Daniel; Thorn, Per-Anders; Haviland, David B.; Bergqvist, Jonas; Ingans, Olle

    2014-10-06

    We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance frequency. Frequency mixing due to the nonlinear capacitance gives intermodulation products of the two drive frequencies near the cantilever resonance, where they are measured with high signal to noise ratio. Analysis of this intermodulation response allows for quantitative reconstruction of the contact potential difference. We derive the theory of the method, validate it with numerical simulation and a control experiment, and we demonstrate its utility for fast imaging of the surface photo-voltage on an organic photo-voltaic material.

  5. Automatic HTS force measurement instrument

    DOE Patents [OSTI]

    Sanders, Scott T.; Niemann, Ralph C.

    1999-01-01

    A device for measuring the levitation force of a high temperature superconductor sample with respect to a reference magnet includes a receptacle for holding several high temperature superconductor samples each cooled to superconducting temperature. A rotatable carousel successively locates a selected one of the high temperature superconductor samples in registry with the reference magnet. Mechanism varies the distance between one of the high temperature superconductor samples and the reference magnet, and a sensor measures levitation force of the sample as a function of the distance between the reference magnet and the sample. A method is also disclosed.

  6. Automatic HTS force measurement instrument

    DOE Patents [OSTI]

    Sanders, S.T.; Niemann, R.C.

    1999-03-30

    A device is disclosed for measuring the levitation force of a high temperature superconductor sample with respect to a reference magnet includes a receptacle for holding several high temperature superconductor samples each cooled to superconducting temperature. A rotatable carousel successively locates a selected one of the high temperature superconductor samples in registry with the reference magnet. Mechanism varies the distance between one of the high temperature superconductor samples and the reference magnet, and a sensor measures levitation force of the sample as a function of the distance between the reference magnet and the sample. A method is also disclosed. 3 figs.

  7. Atomic memory access hardware implementations

    SciTech Connect (OSTI)

    Ahn, Jung Ho; Erez, Mattan; Dally, William J

    2015-02-17

    Atomic memory access requests are handled using a variety of systems and methods. According to one example method, a data-processing circuit having an address-request generator that issues requests to a common memory implements a method of processing the requests using a memory-access intervention circuit coupled between the generator and the common memory. The method identifies a current atomic-memory access request from a plurality of memory access requests. A data set is stored that corresponds to the current atomic-memory access request in a data storage circuit within the intervention circuit. It is determined whether the current atomic-memory access request corresponds to at least one previously-stored atomic-memory access request. In response to determining correspondence, the current request is implemented by retrieving data from the common memory. The data is modified in response to the current request and at least one other access request in the memory-access intervention circuit.

  8. Atomizing, continuous, water monitoring module

    DOE Patents [OSTI]

    Thompson, C.V.; Wise, M.B.

    1997-07-08

    A system for continuously analyzing volatile constituents of a liquid is described. The system contains a pump for continuously pumping the liquid to be tested at a predetermined flow rate into an extracting container through a liquid directing tube having an orifice at one end and positioned to direct the liquid into the extracting container at a flow rate sufficient to atomize the liquid within the extracting container. A continuous supply of helium carrier gas at a predetermined flow rate is directed through a tube into the extracting container and co-mingled with the atomized liquid to extract the volatile constituents contained within the atomized liquid. The helium containing the extracted volatile constituents flows out of the extracting container into a mass spectrometer for an analysis of the volatile constituents of the liquid. 3 figs.

  9. Atomizing, continuous, water monitoring module

    DOE Patents [OSTI]

    Thompson, Cyril V.; Wise, Marcus B.

    1997-01-01

    A system for continuously analyzing volatile constituents of a liquid is described. The system contains a pump for continuously pumping the liquid to be tested at a predetermined flow rate into an extracting container through a liquid directing tube having an orifice at one end and positioned to direct the liquid into the extracting container at a flow rate sufficient to atomize the liquid within the extracting container. A continuous supply of helium carrier gas at a predetermined flow rate is directed through a tube into the extracting container and co-mingled with the atomized liquid to extract the volatile constituents contained within the atomized liquid. The helium containing the extracted volatile constituents flows out of the extracting container into a mass spectrometer for an analysis of the volatile constituents of the liquid.

  10. Hot atom chemistry and radiopharmaceuticals

    SciTech Connect (OSTI)

    Krohn, Kenneth A.; Moerlein, Stephen M.; Link, Jeanne M.; Welch, Michael J.

    2012-12-19

    The chemical products made in a cyclotron target are a combined result of the chemical effects of the nuclear transformation that made the radioactive atom and the bulk radiolysis in the target. This review uses some well-known examples to understand how hot atom chemistry explains the primary products from a nuclear reaction and then how radiation chemistry is exploited to set up the optimal product for radiosynthesis. It also addresses the chemical effects of nuclear decay. There are important principles that are common to hot atom chemistry and radiopharmaceutical chemistry. Both emphasize short-lived radionuclides and manipulation of high specific activity nuclides. Furthermore, they both rely on radiochromatographic separation for identification of no-carrieradded products.

  11. Atomic hydrogen in planetary nebulae

    SciTech Connect (OSTI)

    Schneider, S.E.; Silverglate, P.R.; Altschuler, D.R.; Giovanardi, C.

    1987-03-01

    The authors searched for neutral atomic hydrogen associated with 22 planetary nebulae and three evolved stars in the 21 cm line at the Arecibo Observatory. Objects whose radial velocities permitted discrimination from Galactic H I were chosen for observation. Hydrogen was detected in absorption from IC 4997. From the measurements new low limits are derived to the mass of atomic hydrogen associated with the undetected nebulae. Radio continuum observations were also made of several of the nebulae at 12.6 cm. The authors reexamine previous measurements of H I in planetary nebulae, and present the data on a consistent footing. The question of planetary nebula distances is considered at length. Finally, implications of the H I measurements for nebular evolution are discussed and it is suggested that atomic hydrogen seen in absorption was expelled from the progenitor star during the final 1000 yr prior to the onset of ionization. 68 references.

  12. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2013-01-22

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  13. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2009-06-23

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  14. A Microscopic Quantal Model for Nuclear Collective Rotation

    SciTech Connect (OSTI)

    Gulshani, P.

    2007-10-26

    A microscopic, quantal model to describe nuclear collective rotation in two dimensions is derived from the many-nucleon Schrodinger equation. The Schrodinger equation is transformed to a body-fixed frame to decompose the Hamiltonian into a sum of intrinsic and rotational components plus a Coriolis-centrifugal coupling term. This Hamiltonian (H) is expressed in terms of space-fixed-frame particle coordinates and momenta by using commutator of H with a rotation angle. A unified-rotational-model type wavefunction is used to obtain an intrinsic Schrodinger equation in terms of angular momentum quantum number and two-body operators. A Hartree-Fock mean-field representation of this equation is then obtained and, by means of a unitary transformation, is reduced to a form resembling that of the conventional semi-classical cranking model when exchange terms and intrinsic spurious collective excitation are ignored.

  15. Identification of microscopic hole-trapping mechanisms in nitride semiconductors

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    John L. Lyons; Krishnaswamy, Karthik; Luke Gordon; Van de Walle, Chris G.; Anderson, Janotti

    2015-12-17

    Hole trapping has been observed in nitride heterostructure devices, where the Fermi level is in the vicinity of the valence-band maximum. Using hybrid density functional calculations, we examine microscopic mechanisms for hole trapping in GaN and AlN. In a defect-free material, hole trapping does not spontaneously occur, but trapping can occur in the vicinity of impurities, such as C-a common unintentional impurity in nitrides. As a result, using Schrödinger-Poisson simulations, we assess the effects of C-derived hole traps on N-face high-electron mobility transistors, which we find to be more detrimental than the previously proposed interface traps.

  16. Transmission electron microscope sample holder with optical features

    DOE Patents [OSTI]

    Milas, Mirko; Zhu, Yimei; Rameau, Jonathan David

    2012-03-27

    A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.

  17. Scanning optical microscope with long working distance objective

    DOE Patents [OSTI]

    Cloutier, Sylvain G.

    2010-10-19

    A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.

  18. Nano-mechanics of Tunable Adhesion using Non Covalent Forces

    SciTech Connect (OSTI)

    Kenneth Liechti

    2012-09-08

    The objective of this program was to examine, via experiment and atomistic and continuum analysis, coordinated noncovalent bonding over a range of length scales with a view to obtaining modulated, patterned and reversible bonding at the molecular level. The first step in this project was to develop processes for depositing self-assembled monolayers (SAMs) bearing carboxylic acid and amine moieties on Si (111) surfaces and probe tips of an interfacial force microscope (IFM). This allowed the adhesive portion of the interactions between functionalized surfaces to be fully captured in the force-displacement response (force profiles) that are measured by the IFM. The interactionswere extracted in the form of traction-separation laws using combined molecular and continuum stress analyses. In this approach, the results of molecular dynamics analyses of SAMs subjected to simple stress states are used to inform continuum models of their stress-strain behavior. Continuum analyses of the IFM experiment were then conducted, which incorporate the stress-strain behavior of the SAMs and traction-separation relations that represent the interactions between the tip and functionalized Si surface. Agreement between predicted and measured force profiles was taken to imply that the traction-separation relations have been properly extracted. Scale up to larger contact areas was considered by forming Si/SAM/Si sandwiches and then separating them via fracture experiments. The mode 1 traction-separation relations have been extracted using fracture mechanics concepts under mode 1 and mixed-mode conditions. Interesting differences were noted between the three sets of traction-separation relations.

  19. Verification of maximum impact force for interim storage cask for the Fast Flux Testing Facility

    SciTech Connect (OSTI)

    Chen, W.W.; Chang, S.J.

    1996-06-01

    The objective of this paper is to perform an impact analysis of the Interim Storage Cask (ISC) of the Fast Flux Test Facility (FFTF) for a 4-ft end drop. The ISC is a concrete cask used to store spent nuclear fuels. The analysis is to justify the impact force calculated by General Atomics (General Atomics, 1994) using the ILMOD computer code. ILMOD determines the maximum force developed by the concrete crushing which occurs when the drop energy has been absorbed. The maximum force, multiplied by the dynamic load factor (DLF), was used to determine the maximum g-level on the cask during a 4-ft end drop accident onto the heavily reinforced FFTF Reactor Service Building`s concrete surface. For the analysis, this surface was assumed to be unyielding and the cask absorbed all the drop energy. This conservative assumption simplified the modeling used to qualify the cask`s structural integrity for this accident condition.

  20. Robust quantum logic in neutral atoms via adiabatic Rydberg dressing

    SciTech Connect (OSTI)

    Keating, Tyler; Cook, Robert L.; Hankin, Aaron M.; Jau, Yuan -Yu; Biedermann, Grant W.; Deutsch, Ivan H.

    2015-01-28

    We study a scheme for implementing a controlled-Z (CZ) gate between two neutral-atom qubits based on the Rydberg blockade mechanism in a manner that is robust to errors caused by atomic motion. By employing adiabatic dressing of the ground electronic state, we can protect the gate from decoherence due to random phase errors that typically arise because of atomic thermal motion. In addition, the adiabatic protocol allows for a Doppler-free configuration that involves counterpropagating lasers in a ?+/?- orthogonal polarization geometry that further reduces motional errors due to Doppler shifts. The residual motional error is dominated by dipole-dipole forces acting on doubly-excited Rydberg atoms when the blockade is imperfect. As a result, for reasonable parameters, with qubits encoded into the clock states of 133Cs, we predict that our protocol could produce a CZ gate in < 10 ?s with error probability on the order of 10-3.

  1. Robust quantum logic in neutral atoms via adiabatic Rydberg dressing

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Keating, Tyler; Cook, Robert L.; Hankin, Aaron M.; Jau, Yuan -Yu; Biedermann, Grant W.; Deutsch, Ivan H.

    2015-01-28

    We study a scheme for implementing a controlled-Z (CZ) gate between two neutral-atom qubits based on the Rydberg blockade mechanism in a manner that is robust to errors caused by atomic motion. By employing adiabatic dressing of the ground electronic state, we can protect the gate from decoherence due to random phase errors that typically arise because of atomic thermal motion. In addition, the adiabatic protocol allows for a Doppler-free configuration that involves counterpropagating lasers in a σ+/σ- orthogonal polarization geometry that further reduces motional errors due to Doppler shifts. The residual motional error is dominated by dipole-dipole forces actingmore » on doubly-excited Rydberg atoms when the blockade is imperfect. As a result, for reasonable parameters, with qubits encoded into the clock states of 133Cs, we predict that our protocol could produce a CZ gate in < 10 μs with error probability on the order of 10-3.« less

  2. Casimir force in absorbing multilayers

    SciTech Connect (OSTI)

    Tomas, M.S.

    2002-11-01

    The Casimir effect in a dispersive and absorbing multilayered system is considered adopting the (net) vacuum-field pressure point of view to the Casimir force. Using the properties of the macroscopic field operators appropriate for absorbing systems and a convenient compact form of the Green function for a multilayer, a straightforward and transparent derivation of the Casimir force in a lossless layer of an otherwise absorbing multilayer is presented. The resulting expression, in terms of the reflection coefficients of the surrounding stacks of layers, is of the same form as that obtained by Zhou and Spruch for a purely dispersive multilayer using the (surface) mode summation method [Phys. Rev. A 52, 297 (1995)]. Owing to the recursion relations that the generalized Fresnel coefficients satisfy, this result can be applied to more complex systems with planar symmetry. This is illustrated by calculating the Casimir force on a dielectric (metallic) slab in a planar cavity with realistic mirrors. Also, a relationship between the Casimir force and energy in two different layers is established.

  3. On the calculation of internal forces in mechanically stressed polyatomic molecules

    SciTech Connect (OSTI)

    Avdoshenko, Stanislav M.; Konda, Sai Sriharsha M.; Makarov, Dmitrii E.

    2014-10-07

    We discuss how to define and to compute internal forces in a molecule subjected to mechanical stress. Because of the inherently many-body character of intramolecular interactions, internal forces cannot be uniquely defined without specifying a set of internal coordinates used to describe the molecular structure. When such a set is comprised of 3N − 6 interactomic distances (N being the number of atoms) and includes the bond lengths of interest, we show that the associated forces, while satisfying the equation F = ∂V/∂R (where R is the bond length, F is the internal force in this bond, and V is the potential energy of the molecule), can be determined from the molecular geometry alone. We illustrate these ideas using several toy models ranging from small molecules to a graphene sheet and show that the magnitude of the internal force in a bond is not necessarily a good predictor of its strength in response to mechanical loading. At the same time, analysis of internal forces reveals interesting phenomena such as the force multiplication effect, where weak external forces may, e.g., be used to break strong bonds, and offers insight into the catch-bond phenomenon where chemical reactivity is suppressed through application of a force.

  4. High pressure injection and atomization characteristics of methanol

    SciTech Connect (OSTI)

    Aigal, A.K.; Pundir, B.P.; Khatchian, A.S.

    1986-01-01

    Research on conversion of diesel engines for operation on methanol is, currently, of worldwide interest. Due to requirements of higher cyclic delivery of methanol and changes in fuel properties e.g. compressibility, wave propagation velocity, viscosity, surface tension, density etc., injection and atomization characteristics of methanol are expected to be different from diesel. From the equation of continuity and forces acting on the injection system elements and applying the principles of similarity, modifications required in the injection system were identified. Methanol injection and atomization characteristics were studied with a modified injection system and compared with those observed with diesel fuel. Methanol gave more favourable cyclic delivery characteristics than diesel. Laser diffraction technique was used to study time and space resolved drop size distribution in methanol and diesel sprays. With methanol, drop size distribution were, generally, much narrower and droplets were smaller than diesel. Spatial distribution of drop size in methanol spray showed somewhat different trends than for diesel.

  5. Relativistic atomic beam spectroscopy II

    SciTech Connect (OSTI)

    1989-12-31

    The negative ion of H is one of the simplest 3-body atomic systems. The techniques we have developed for experimental study of atoms moving near speed of light have been productive. This proposal request continuing support for experimental studies of the H{sup -} system, principally at the 800 MeV linear accelerator (LAMPF) at Los Alamos. Four experiments are currently planned: photodetachment of H{sup -} near threshold in electric field, interaction of relativistic H{sup -} ions with matter, high excitations and double charge escape in H{sup -}, and multiphoton detachment of electrons from H{sup -}.

  6. Fuel oil quality task force

    SciTech Connect (OSTI)

    Laisy, J.; Turk, V.

    1997-09-01

    In April, 1996, the R.W. Beckett Corporation became aware of a series of apparently unrelated symptoms that made the leadership of the company concerned that there could be a fuel oil quality problem. A task force of company employees and industry consultants was convened to address the topic of current No. 2 heating oil quality and its effect on burner performance. The task force studied changes in fuel oil specifications and trends in properties that have occurred over the past few years. Experiments were performed at Beckett and Brookhaven National Laboratory to understand the effect of changes in some fuel oil properties. Studies by other groups were reviewed, and field installations were inspected to gain information about the performance of fuel oil that is currently being used in the U.S. and Canada. There was a special concern about the use of red dye in heating oils and the impact of sulfur levels due to the October, 1993 requirement of low sulfur (<0.05%) for on-highway diesel fuel. The results of the task force`s efforts were published in July, 1996. The primary conclusion of the task force was that there is not a crisis or widespread general problem with fuel oil quality. Localized problems that were seen may have been related to refinery practices and/or non-traditional fuel sources. System cleanliness is very important and the cause of many oil burner system problems. Finally, heating oil quality should get ongoing careful attention by Beckett engineering personnel and heating oil industry groups.

  7. Solvent-induced forces in protein folding

    SciTech Connect (OSTI)

    Ben-Naim, A. (Hebrew Univ., Jerusalem (Israel))

    1990-08-23

    The solvent-induced forces between various groups on the protein are examined. It is found that the intramolecular hydrophilic forces are likely to be the strongest forces mediated through the solvent. It is argued that these are probably the most important solvent-induced driving forces in the process of protein folding.

  8. October 9, 2014- SEAB Task Force Meeting

    Broader source: Energy.gov [DOE]

    SECRETARY OF ENERGY ADVISORY BOARDTask Force Meeting on Technology Development for Environmental Management (EM)

  9. BEAM TRANSPORT AND STORAGE WITH COLD NEUTRAL ATOMS AND MOLECULES

    SciTech Connect (OSTI)

    Walstrom, Peter L.

    2012-05-15

    A large class of cold neutral atoms and molecules is subject to magnetic field-gradient forces. In the presence of a field, hyperfine atomic states are split into several Zeeman levels. The slopes of these curves vs. field are the effective magnetic moments. By means of optical pumping in a field, Zeeman states of neutral lithium atoms and CaH molecules with effective magnetic moments of nearly {+-} one Bohr magneton can be selected. Particles in Zeeman states for which the energy increases with field are repelled by increasing fields; particles in states for which the energy decreases with field are attracted to increasing fields. For stable magnetic confinement, field-repelled states are required. Neutral-particle velocities in the present study are on the order of tens to hundreds of m/s and the magnetic fields needed for transport and injection are on the order of in the range of 0.01-1T. Many of the general concepts of charged-particle beam transport carry over into neutral particle spin-force optics, but with important differences. In general, the role of bending dipoles in charged particle optics is played by quadrupoles in neutral particle optics; the role of quadrupoles is played by sextupoles. The neutralparticle analog of charge-exchange injection into storage rings is the use of lasers to flip the state of particles from field-seeking to field-repelled. Preliminary tracking results for two neutral atom/molecule storage ring configurations are presented. It was found that orbit instabilities limit the confinment time in a racetrack-shaped ring with discrete magnetic elements with drift spaces between them; stable behavior was observed in a toroidal ring with a continuous sextupole field. An alternative concept using a linear sextupole or octupole channel with solenoids on the ends is presently being considered.

  10. Microscopic origin of quantum chaos in rotational damping

    SciTech Connect (OSTI)

    Matsuo, M.; Dossing, T.; Vigezzi, E.; Broglia, R.A. (Yukawa Institute for Theoretical Physics, Kyoto University, Kyoto (Japan) The Niels Bohr Institute, University of Copenhagen (Denmark) Instituto Nazionale di Fisica Nucleare, Sezione di Milano, Milano (Italy) Departimento di Fisica dell'Universita di Milano, Milano (Italy))

    1993-05-03

    The rotational spectrum of [sup 168]Yb is calclated by diagonalizing different effective interactions within the basis of unperturbed rotational bands provided by the cranked shell model. A transition between order and chaos taking place in the energy region between 1 and 2 MeV above the yrast line is observed, associated with the onset of rotational damping. It can be related to the higher multipole components of the force acting among the unperturbed rotational bands.

  11. Growth analysis of cadmium sulfide thin films by atomic force microscopy

    SciTech Connect (OSTI)

    Moutinho, H.R.; Dhere, R.G.; Ramanathan, K.

    1996-05-01

    CdS films have been deposited by solution growth on SnO{sub 2} and glass substrates. Nucleation on SnO{sub 2} occurs at early deposition times, and complete conformal coverage is observed at low thickness values. The average grain size of the CdS films is established at these early times. In films deposited on glass substrates, nucleation is slower and occurs through 3-dimensional islands that increase in size and number as deposition proceeds. Optical measurements show that the bandgap values of CdS films deposited on SnO{sub 2} depend mainly on substrate structure. Hydrogen heat treatment does not affect the surface morphology of the samples, but decreases bandgap values.

  12. Mode-synthesizing atomic force microscopy and mode-synthesizing sensing

    DOE Patents [OSTI]

    Passain, Ali; Thundat, Thomas George; Tetard, Laurene

    2014-07-22

    A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.

  13. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Acoustic Detection of Phase Transitions at the Nanoscale Vasudevan, Rama K. ; Khassaf, ... detection in nanoscale volumes by use of an atomic force microscope tip technique. ...

  14. Self-Assembly of Polymer Nano-Elements on Sapphire

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    consisting of a central polymer (blue) linked to a surrounding polymer (red). An atomic-force microscope image (center) shows the densely packed cylinders, dark in the...

  15. --No Title--

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    of applying localized mechanical stress (due to sliding contact with the tip of an atomic force microscope-AFM) to slightly soluble inorganic crystals in the presence of...

  16. Microsoft PowerPoint - Strelcov_2015_StaffScienceHighlight_NatSciRepor...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    polarity and ionic solid solubility are shown to strongly influence friction between the atomic force microscope (AFM) tip and salt surface. An increase in friction is associated...

  17. DOE-Funded Research Projects Win 39 R&D Awards for 2010 | Department...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    ... Strontium Iodide Scintillator for Gamma Ray Spectroscopy: This project was submitted by ... Mode-Synthesizing Atomic Force Microscope: This novel measurement system can obtain a ...

  18. National Renewable Energy Laboratory 10 Year Site Plan FY2007...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    ... electron, atomic force, and other microscopes for surface studies of all solid-state materials including thin-films, nanostructures, and organic solids * X-ray diffraction, ...

  19. Remote control of a scanning electron microscope aperture and gun alignment

    DOE Patents [OSTI]

    Cramer, Charles E.; Campchero, Robert J.

    2003-10-07

    This invention relates to a remote control system which through gear motors coupled to the scanning electron microscope (SEM) manual control knobs readily permits remote adjustments as necessary.

  20. In-line three-dimensional holography of nanocrystalline objects at atomic resolution

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Chen, F. -R.; Van Dyck, D.; Kisielowski, C.

    2016-02-18

    We report that resolution and sensitivity of the latest generation aberration-corrected transmission electron microscopes allow the vast majority of single atoms to be imaged with sub-Ångstrom resolution and their locations determined in an image plane with a precision that exceeds the 1.9-pm wavelength of 300 kV electrons. Such unprecedented performance allows expansion of electron microscopic investigations with atomic resolution into the third dimension. Here we show a general tomographic method to recover the three-dimensional shape of a crystalline particle from high-resolution images of a single projection without the need for sample rotation. The method is compatible with low dose ratemore » electron microscopy, which improves on signal quality, while minimizing electron beam-induced structure modifications even for small particles or surfaces. Lastly, we apply it to germanium, gold and magnesium oxide particles, and achieve a depth resolution of 1–2 Å, which is smaller than inter-atomic distances.« less

  1. Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

    SciTech Connect (OSTI)

    Collins, Liam; Jesse, Stephen; Kilpatrick, J.; Tselev, Alexander; Okatan, Mahmut Baris; Kalinin, Sergei V.; Rodriguez, Brian

    2015-01-01

    Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q water and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid–liquid interface.

  2. Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Collins, Liam; Jesse, Stephen; Kilpatrick, J.; Tselev, Alexander; Okatan, Mahmut Baris; Kalinin, Sergei V.; Rodriguez, Brian

    2015-01-01

    Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q watermore » and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid–liquid interface.« less

  3. Photocathode Optimization for a Dynamic Transmission Electron Microscope: Final Report

    SciTech Connect (OSTI)

    Ellis, P; Flom, Z; Heinselman, K; Nguyen, T; Tung, S; Haskell, R; Reed, B W; LaGrange, T

    2011-08-04

    The Dynamic Transmission Electron Microscope (DTEM) team at Harvey Mudd College has been sponsored by LLNL to design and build a test setup for optimizing the performance of the DTEM's electron source. Unlike a traditional TEM, the DTEM achieves much faster exposure times by using photoemission from a photocathode to produce electrons for imaging. The DTEM team's work is motivated by the need to improve the coherence and current density of the electron cloud produced by the electron gun in order to increase the image resolution and contrast achievable by DTEM. The photoemission test setup is nearly complete and the team will soon complete baseline tests of electron gun performance. The photoemission laser and high voltage power supply have been repaired; the optics path for relaying the laser to the photocathode has been finalized, assembled, and aligned; the internal setup of the vacuum chamber has been finalized and mostly implemented; and system control, synchronization, and data acquisition has been implemented in LabVIEW. Immediate future work includes determining a consistent alignment procedure to place the laser waist on the photocathode, and taking baseline performance measurements of the tantalum photocathode. Future research will examine the performance of the electron gun as a function of the photoemission laser profile, the photocathode material, and the geometry and voltages of the accelerating and focusing components in the electron gun. This report presents the team's progress and outlines the work that remains.

  4. Microscopic studies of nonlocal spin dynamics and spin transport (invited)

    SciTech Connect (OSTI)

    Adur, Rohan; Du, Chunhui; Cardellino, Jeremy; Scozzaro, Nicolas; Wolfe, Christopher S.; Wang, Hailong; Herman, Michael; Bhallamudi, Vidya P.; Pelekhov, Denis V.; Yang, Fengyuan; Hammel, P. Chris

    2015-05-07

    Understanding the behavior of spins coupling across interfaces in the study of spin current generation and transport is a fundamental challenge that is important for spintronics applications. The transfer of spin angular momentum from a ferromagnet into an adjacent normal material as a consequence of the precession of the magnetization of the ferromagnet is a process known as spin pumping. We find that, in certain circumstances, the insertion of an intervening normal metal can enhance spin pumping between an excited ferromagnetic magnetization and a normal metal layer as a consequence of improved spin conductance matching. We have studied this using inverse spin Hall effect and enhanced damping measurements. Scanned probe magnetic resonance techniques are a complementary tool in this context offering high resolution magnetic resonance imaging, localized spin excitation, and direct measurement of spin lifetimes or damping. Localized magnetic resonance studies of size-dependent spin dynamics in the absence of lithographic confinement in both ferromagnets and paramagnets reveal the close relationship between spin transport and spin lifetime at microscopic length scales. Finally, detection of ferromagnetic resonance of a ferromagnetic film using the photoluminescence of nitrogen vacancy spins in neighboring nanodiamonds demonstrates long-range spin transport between insulating materials, indicating the complexity and generality of spin transport in diverse, spatially separated, material systems.

  5. High Cycle Fatigue in the Transmission Electron Microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Bufford, Daniel C.; Stauffer, Douglas; Mook, William M.; Syed Asif, S. A.; Boyce, Brad L.; Hattar, Khalid

    2016-06-28

    One of the most common causes of structural failure in metals is fatigue induced by cyclic loading. Historically, microstructure-level analysis of fatigue cracks has primarily been performed post mortem. However, such investigations do not directly reveal the internal structural processes at work near micro- and nanoscale fatigue cracks and thus do not provide direct evidence of active microstructural mechanisms. In this paper, the tension–tension fatigue behavior of nanocrystalline Cu was monitored in real time at the nanoscale by utilizing a new capability for quantitative cyclic mechanical loading performed in situ in a transmission electron microscope (TEM). Controllable loads were appliedmore » at frequencies from one to several hundred hertz, enabling accumulations of 106 cycles within 1 h. The nanometer-scale spatial resolution of the TEM allows quantitative fatigue crack growth studies at very slow crack growth rates, measured here at ~10–12 m·cycle–1. This represents an incipient threshold regime that is well below the tensile yield stress and near the minimum conditions for fatigue crack growth. Evidence of localized deformation and grain growth within 150 nm of the crack tip was observed by both standard imaging and precession electron diffraction orientation mapping. Finally, these observations begin to reveal with unprecedented detail the local microstructural processes that govern damage accumulation, crack nucleation, and crack propagation during fatigue loading in nanocrystalline Cu.« less

  6. Hickam Air Force Base | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Technology Validation » Hickam Air Force Base Hickam Air Force Base Photo of hybrid fuel cell bus at Hickam Air Force Base Hickam Air Force Base spans 2,850 acres in Honolulu, Hawaii. The military base is home to the 15th Airlift Wing, the Hawaii Air National Guard, and the Pacific Air Forces headquarters. With support from the Hawaii Center for Advanced Transportation Technologies and the Air Force Advanced Power Technology Office, Hickam added a fuel cell hybrid electric bus to its fleet in

  7. Impact of Short-Range Forces on Defect Production from High-Energy Collisions

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Stoller, R. E.; Tamm, A.; Béland, L. K.; Samolyuk, G. D.; Stocks, G. M.; Caro, A.; Slipchenko, L. V.; Osetsky, Yu. N.; Aabloo, A.; Klintenberg, M.; et al

    2016-04-25

    Primary radiation damage formation in solid materials typically involves collisions between atoms that have up to a few hundred keV of kinetic energy. The distance between two colliding atoms can approach 0.05 nm during these collisions. At such small atomic separations, force fields fitted to equilibrium properties tend to significantly underestimate the potential energy of the colliding dimer. To enable molecular dynamics simulations of high-energy collisions, it is common practice to use a screened Coulomb force field to describe the interactions and to smoothly join this to the equilibrium force field at a suitable interatomic spacing. But, there is nomore » accepted standard method for choosing the parameters used in the joining process, and our results prove that defect production is sensitive to how the force fields are linked. A new procedure is presented that involves the use of ab initio calculations to determine the magnitude and spatial dependence of the pair interactions at intermediate distances, along with systematic criteria for choosing the joining parameters. Results are presented for the case of nickel, which demonstrate the use and validity of the procedure.« less

  8. Atomic vapor laser isotope separation

    SciTech Connect (OSTI)

    Stern, R.C.; Paisner, J.A.

    1985-11-08

    Atomic vapor laser isotope separation (AVLIS) is a general and powerful technique. A major present application to the enrichment of uranium for light-water power reactor fuel has been under development for over 10 years. In June 1985 the Department of Energy announced the selection of AVLIS as the technology to meet the nation's future need for the internationally competitive production of uranium separative work. The economic basis for this decision is considered, with an indicated of the constraints placed on the process figures of merit and the process laser system. We then trace an atom through a generic AVLIS separator and give examples of the physical steps encountered, the models used to describe the process physics, the fundamental parameters involved, and the role of diagnostic laser measurements.

  9. The Modified Embedded Atom Method

    SciTech Connect (OSTI)

    Baskes, M.I.

    1994-08-01

    Recent modifications have been made to generalize the Embedded Atom Method (EAM) to describe bonding in diverse materials. By including angular dependence of the electron density in an empirical way, the Modified Embedded Atom Method (MEAM) has been able to reproduce the basic energetic and structural properties of 45 elements. This method is ideally suited for examining the interfacial behavior of dissimilar materials. This paper explains in detail the derivation of the method, shows how the parameters of the MEAM are determined directly from experiment or first principles calculations, and examines the quality of the reproduction of the database. Materials with fcc, bcc, hcp, and diamond cubic crystal structure are discussed. A few simple examples of the application of the MEAM to surfaces and interfaces are presented. Calculations of pullout of a SiC fiber in a diamond matrix as a function of applied stress show non-uniform deformation of the fiber.

  10. Casimir-Polder interaction between an atom and an infinite boundary in a thermal bath

    SciTech Connect (OSTI)

    She Wuying; Yu Hongwei; Zhu Zhiying

    2010-01-15

    We study the energy level shift of a static two-level atom interacting with a massless scalar field in a thermal bath with the presence of a plane boundary, which gives rise to the Casimir-Polder force. We separately calculate contributions of both thermal fluctuations and radiation reaction using the formalism suggested by J. Dalibard, J. Dupont-Roc, and C. Cohen-Tannoudji [J. Phys. (France) 43, 1617 (1982); 45, 673 (1984)] and analyze in detail the behaviors of the total energy level shifts in three distinct distance regimes in both the low- and high-temperature limits. A comparison of our results with those of a uniformly accelerated atom reveals that uniformly accelerated atoms, in general, do not behave the same as static ones in a thermal bath at the Unruh temperature in terms of the atomic energy level shifts.

  11. The Future of Atomic Energy

    DOE R&D Accomplishments [OSTI]

    Fermi, E.

    1946-05-27

    There is definitely a technical possibility that atomic power may gradually develop into one of the principal sources of useful power. If this expectation will prove correct, great advantages can be expected to come from the fact that the weight of the fuel is almost negligible. This feature may be particularly valuable for making power available to regions of difficult access and far from deposits of coal. It also may prove a great asset in mobile power units for example in a power plant for ship propulsion. On the negative side there are some technical limitations to be applicability of atomic power of which perhaps the most serious is the impossibility of constructing light power units; also there will be some peculiar difficulties in operating atomic plants, as for example the necessity of handling highly radioactive substances which will necessitate, at least for some considerable period, the use of specially skilled personnel for the operation. But the chief obstacle in the way of developing atomic power will be the difficulty of organizing a large scale industrial development in an internationally safe way. This presents actually problems much more difficult to solve than any of the technical developments that are necessary, It will require an unusual amount of statesmanship to balance properly the necessity of allaying the international suspicion that arises from withholding technical secrets against the obvious danger of dumping the details of the procedures for an extremely dangerous new method of warfare on a world that may not yet be prepared to renounce war. Furthermore, the proper balance should be found in the relatively short time that will elapse before the 'secrets' will naturally become open knowledge by rediscovery on part of the scientists and engineers of other countries.

  12. Casimir force for absorbing media in an open quantum system framework: Scalar model

    SciTech Connect (OSTI)

    Lombardo, Fernando C.; Rubio Lopez, Adrian E.; Mazzitelli, Francisco D.

    2011-11-15

    In this article we compute the Casimir force between two finite-width mirrors at finite temperature, working in a simplified model in 1+1 dimensions. The mirrors, considered as dissipative media, are modeled by a continuous set of harmonic oscillators which in turn are coupled to an external environment at thermal equilibrium. The calculation of the Casimir force is performed in the framework of the theory of open quantum systems. It is shown that the Casimir interaction has two different contributions: the usual radiation pressure from the vacuum, which is obtained for ideal mirrors without dissipation or losses, and a Langevin force associated with the noise induced by the interaction between dielectric atoms in the slabs and the thermal bath. Both contributions to the Casimir force are needed in order to reproduce the analogous Lifshitz formula in 1+1 dimensions. We also discuss the relationship between the electromagnetic properties of the mirrors and the spectral density of the environment.

  13. Atomic vapor laser isotope separation process

    DOE Patents [OSTI]

    Wyeth, R.W.; Paisner, J.A.; Story, T.

    1990-08-21

    A laser spectroscopy system is utilized in an atomic vapor laser isotope separation process. The system determines spectral components of an atomic vapor utilizing a laser heterodyne technique. 23 figs.

  14. Princeton Plasma Physics Lab - General Atomics (GA)

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    general-atomics-ga General Atomics en The Scorpion's Strategy: "Catch and Subdue" http:www.pppl.govnode1132

  15. SAVANNAH RIVER SITE FORCE REPORT

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    FORCE REPORT 3rd Quarter - FY 2016 Data Date:June 30, 2016 Feds/ Prime Contract 1st Tier Teaming Subs Staff Aug / Support Service Craft / Union Hall / Trades Part Time / Limited Service Site TOTAL Federal Organizations DOE-SR 269 7 62 - - 338 DOE-OIG-SR 15 1 - - - 16 NNSA-SRFO 24 1 - 25 NNSA APM 20 2 12 - - 34 NNSA NA-23 10 - 3 - - 13 EM Only Total 269 8 62 - - 339 NNSA Only Total 54 2 16 - - 72 Other Funding Total 15 - - - - 15 Federal Total 338 10 78 - - 426 SRS Contracts SRNS 4,644 - 359 317

  16. ARMY SERiWE FORCES

    Office of Legacy Management (LM)

    ' This doc~omnt consists tif-..$---..-- PaWs ?5-i3s4 " No.,J ______ d&---.copies. series.-f;;i, ' ARMY SERiWE FORCES UNITED STATES ' ENGINEER OFFICE MANHP.~AN Dwmtcr CHIWOO A\RU o,,,c* P. 0. 90x 3140 A CHICA so, ILrlNole 20 June 1945 F' '2 0 Subject: Licenae Agreement - International Pulverizing Corporation - Subcoritract #7401-37-82. To: The District~Eqinssr, U. S. Engineer Office, Manhattan District, Oak Ridge, Tennessee. Attention: Contract Section. As llsted'below, there are

  17. Link Force Holdings Ltd | Open Energy Information

    Open Energy Info (EERE)

    search Name: Link Force Holdings Ltd Place: China Product: China-based energy saving LED street light maker. References: Link Force Holdings Ltd1 This article is a stub. You...

  18. US Wind Force LLC | Open Energy Information

    Open Energy Info (EERE)

    Jump to: navigation, search Name: US Wind Force LLC Place: Wexford, Pennsylvania Zip: PA 15090-9 Sector: Wind energy Product: US Wind Force, LLC is an independent, privately...

  19. ESPC Success Story - Dyess Air Force Base

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    DYESS AIR FORCE BASE DYESS, TEXAS Water Conservation and Green Energy ESPC SUCCESS STORY Dyess Air Force Base and surrounding west Texas has been under extreme-drought water ...

  20. The Atomic Energy Commission By Alice Buck

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Atomic Energy Commission By Alice Buck July 1983 U.S. Department of Energy Office of Management Office of the Executive Secretariat Office of History and Heritage Resources 1 Introduction Almost a year after World War II ended, Congress established the United States Atomic Energy Commission to foster and control the peacetime development of atomic science and technology. Reflecting America's postwar optimism, Congress declared that atomic energy should be employed not only in the Nation's

  1. How Atomic Vibrations Transform Vanadium Dioxide

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    How Atomic Vibrations Transform Vanadium Dioxide How Atomic Vibrations Transform Vanadium Dioxide Calculations Confirm Material's Potential for Next-Generation Electronics, Energy November 10, 2014 Contact: Dawn Levy, levyd@ornl.gov, 865.576.6448 Budaivibe Vanadium atoms (blue) have unusually large thermal vibrations that stabilize the metallic state of a vanadium dioxide crystal. Red depicts oxygen atoms. Image credit: Oak Ridge National Laboratory For more than 50 years, scientists have

  2. U.S. Air Force (USAF) Air Force Research Laboratory (AFRL)

    Broader source: Energy.gov (indexed) [DOE]

    Benjamin Leever U.S. Air Force (USAF) Air Force Research Laboratory (AFRL) DOE - DoD ... level - Fourth level Fifth level - - - DOD Application Commercial Counterparts Sensor ...

  3. September 2012, Work Force Retention Work Group Status Overview

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Work Force Retention Work Group Status Overview 2 Subgroups: Pro-Force and Non-Pro-Force Pro-Force Subgroup: Accomplishments: 1. Completion of 10 CFR 1046 Protective Force ...

  4. Macro- and microscopic properties of strontium doped indium oxide

    SciTech Connect (OSTI)

    Nikolaenko, Y. M.; Kuzovlev, Y. E.; Medvedev, Y. V.; Mezin, N. I.; Fasel, C.; Gurlo, A.; Schlicker, L.; Bayer, T. J. M.; Genenko, Y. A.

    2014-07-28

    Solid state synthesis and physical mechanisms of electrical conductivity variation in polycrystalline, strontium doped indium oxide In{sub 2}O{sub 3}:(SrO){sub x} were investigated for materials with different doping levels at different temperatures (T?=?20300?C) and ambient atmosphere content including humidity and low pressure. Gas sensing ability of these compounds as well as the sample resistance appeared to increase by 4 and 8 orders of the magnitude, respectively, with the doping level increase from zero up to x?=?10%. The conductance variation due to doping is explained by two mechanisms: acceptor-like electrical activity of Sr as a point defect and appearance of an additional phase of SrIn{sub 2}O{sub 4}. An unusual property of high level (x?=?10%) doped samples is a possibility of extraordinarily large and fast oxygen exchange with ambient atmosphere at not very high temperatures (100200?C). This peculiarity is explained by friable structure of crystallite surface. Friable structure provides relatively fast transition of samples from high to low resistive state at the expense of high conductance of the near surface layer of the grains. Microscopic study of the electro-diffusion process at the surface of oxygen deficient samples allowed estimation of the diffusion coefficient of oxygen vacancies in the friable surface layer at room temperature as 3??10{sup ?13}?cm{sup 2}/s, which is by one order of the magnitude smaller than that known for amorphous indium oxide films.

  5. Gauss Sum Factorization with Cold Atoms

    SciTech Connect (OSTI)

    Gilowski, M.; Wendrich, T.; Mueller, T.; Ertmer, W.; Rasel, E. M. [Institut fuer Quantenoptik, Leibniz Universitaet Hannover, Welfengarten 1, D-30167 Hannover (Germany); Jentsch, Ch. [Astrium GmbH-Satellites, 88039 Friedrichshafen (Germany); Schleich, W. P. [Institut fuer Quantenphysik, Universitaet Ulm, Albert-Einstein-Allee 11, D-89081 Ulm (Germany)

    2008-01-25

    We report the first implementation of a Gauss sum factorization algorithm by an internal state Ramsey interferometer using cold atoms. A sequence of appropriately designed light pulses interacts with an ensemble of cold rubidium atoms. The final population in the involved atomic levels determines a Gauss sum. With this technique we factor the number N=263193.

  6. Atomic-scale microstructure underneath nanoindentation in Al-Cr-N ceramic films

    SciTech Connect (OSTI)

    Zhuang, Chunqiang Li, Zhipeng; Lin, Songsheng

    2015-12-15

    In this work, Al-Cr-N ceramic films deformed by nanoindentation were peeled off from silicon substrates and their atomic-scale microstructures underneath the indenter were investigated by high resolution transmission electron microscope (HR-TEM). Dislocations were formed underneath the indenter and they accumulated along nano-grain boundaries. The accumulative dislocations triggered the crack initiation along grain boundaries, and further resulted in the crack propagation. Dislocations were also observed in nano-grains on the lateral contact area. A model was proposed to describe the variation of microstructures under nanoindentation.

  7. NREL: Biomass Research - Biomass Characterization Capabilities

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Biomass Characterization Capabilities A photo of a man wearing a white lab coat and looking into a large microscope. A researcher uses an Atomic Force Microscope to image enzymes...

  8. Atomic Structure Calculations from the Los Alamos Atomic Physics Codes

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Cowan, R. D.

    The well known Hartree-Fock method of R.D. Cowan, developed at Los Alamos National Laboratory, is used for the atomic structure calculations. Electron impact excitation cross sections are calculated using either the distorted wave approximation (DWA) or the first order many body theory (FOMBT). Electron impact ionization cross sections can be calculated using the scaled hydrogenic method developed by Sampson and co-workers, the binary encounter method or the distorted wave method. Photoionization cross sections and, where appropriate, autoionizations are also calculated. Original manuals for the atomic structure code, the collisional excitation code, and the ionization code, are available from this website. Using the specialized interface, you will be able to define the ionization stage of an element and pick the initial and final configurations. You will be led through a series of web pages ending with a display of results in the form of cross sections, collision strengths or rates coefficients. Results are available in tabular and graphic form.

  9. Quantitative in-situ scanning electron microscope pull-out experiments and molecular dynamics simulations of carbon nanotubes embedded in palladium

    SciTech Connect (OSTI)

    Hartmann, S., E-mail: steffen.hartmann@etit.tu-chemnitz.de; Blaudeck, T.; Hermann, S.; Wunderle, B. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Hlck, O. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Fraunhofer IZM Berlin, Gustav-Meyer-Allee 25, 13355 Berlin (Germany); Schulz, S. E.; Gessner, T. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Fraunhofer ENAS Chemnitz, Technologie-Campus 3, 09126 Chemnitz (Germany)

    2014-04-14

    In this paper, we present our results of experimental and numerical pull-out tests on carbon nanotubes (CNTs) embedded in palladium. We prepared simple specimens by employing standard silicon wafers, physical vapor deposition of palladium and deposition of CNTs with a simple drop coating technique. An AFM cantilever with known stiffness connected to a nanomanipulation system was utilized inside a scanning electron microscope (SEM) as a force sensor to determine forces acting on a CNT during the pull-out process. SEM-images of the cantilever attached to a CNT have been evaluated for subsequent displacement steps with greyscale correlation to determine the cantilever deflection. We compare the experimentally obtained pull-out forces with values of numerical investigations by means of molecular dynamics and give interpretations for deviations according to material impurities or defects and their influence on the pull-out data. We find a very good agreement of force data from simulation and experiment, which is 17 nN and in the range of 1061 nN, respectively. Our findings contribute to the ongoing research of the mechanical characterization of CNT-metal interfaces. This is of significant interest for the design of future mechanical sensors utilizing the intrinsic piezoresistive effect of CNTs or other future devices incorporating CNT-metal interfaces.

  10. QUANTUM MECHANICS, GENERAL PHYSICS; 74 ATOMIC AND MOLECULAR PHYSICS...

    Office of Scientific and Technical Information (OSTI)

    of model atoms in fields Milonni, P.W. 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 74 ATOMIC AND MOLECULAR PHYSICS; ATOMS; OPTICAL MODELS; QUANTUM MECHANICS;...

  11. Micromechanism linear actuator with capillary force sealing

    DOE Patents [OSTI]

    Sniegowski, Jeffry J.

    1997-01-01

    A class of micromachine linear actuators whose function is based on gas driven pistons in which capillary forces are used to seal the gas behind the piston. The capillary forces also increase the amount of force transmitted from the gas pressure to the piston. In a major subclass of such devices, the gas bubble is produced by thermal vaporization of a working fluid. Because of their dependence on capillary forces for sealing, such devices are only practical on the sub-mm size scale, but in that regime they produce very large force times distance (total work) values.

  12. Achieving atomic resolution magnetic dichroism by controlling the phase symmetry of an electron probe

    SciTech Connect (OSTI)

    Rusz, Jan; Idrobo, Juan -Carlos; Bhowmick, Somnath

    2014-09-30

    The calculations presented here reveal that an electron probe carrying orbital angular momentum is just a particular case of a wider class of electron beams that can be used to measure electron magnetic circular dichroism (EMCD) with atomic resolution. It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning transmission electron microscope. The probe’s required phase distribution depends on the sample’s magnetic symmetry and crystal structure. The calculations indicate that EMCD signals that use the electron probe’s phase are as strong as those obtained by nanodiffraction methods.

  13. Achieving atomic resolution magnetic dichroism by controlling the phase symmetry of an electron probe

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Rusz, Jan; Idrobo, Juan -Carlos; Bhowmick, Somnath

    2014-09-30

    The calculations presented here reveal that an electron probe carrying orbital angular momentum is just a particular case of a wider class of electron beams that can be used to measure electron magnetic circular dichroism (EMCD) with atomic resolution. It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning transmission electron microscope. The probe’s required phase distribution depends on the sample’s magnetic symmetry and crystal structure. The calculations indicate that EMCD signals that use the electron probe’s phase are as strongmore » as those obtained by nanodiffraction methods.« less

  14. Understanding glass-forming ability through sluggish crystallization of atomically thin metallic glassy films

    SciTech Connect (OSTI)

    Sun, Y. T.; Cao, C. R.; Huang, K. Q.; Zhao, N. J.; Gu, L. E-mail: dzheng@iphy.ac.cn Zheng, D. N. E-mail: dzheng@iphy.ac.cn Wang, W. H. E-mail: dzheng@iphy.ac.cn

    2014-08-04

    The glass-forming ability (GFA) of an alloy, closely related to its ability to resist crystallization, is a crucial issue in condensed matter physics. So far, the studies on GFA are mostly statistical and empirical guides. Benefiting from the ultrahigh thermal stability of ultrathin metallic glassy film and high resolution spherical aberration-corrected transmission electron microscope, the crystallization of atomically thin ZrCu and its microalloyed ZrCuAl glasses with markedly different GFA was investigated at the atomic scale. We find the Zr diffusivity estimated from the density of nuclei is dramatically decreased by adding of Al, which is the major reason for the much better GFA of the ZrCuAl metallic glass.

  15. Dark Forces At The Tevatron

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Buckley, Matt; Fileviez Perez, Pavel; Hooper, Dan; Neil, Ethan

    2011-08-19

    A simple explanation of the W + dijet excess recently reported by the CDF collaboration involves the introduction of a new gauge boson with sizable couplings to quarks, but with no or highly suppressed couplings to leptons. Anomaly-free theories which include such a leptophobic gauge boson must also include additional particle content, which may include a stable and otherwise viable candidate for dark matter. Based on the couplings and mass of the Z` required to generate the CDF excess, we predict such a dark matter candidate to possess an elastic scattering cross section with nucleons on the order of σmore » ~ 10-40 cm2, providing a natural explanation for the signals reported by the CoGeNT and DAMA/LIBRA collaborations. In this light, CDF may be observing the gauge boson responsible for the force which mediates the interactions between the dark and visible matter of our universe.« less

  16. Development and applications of the positron microscope. Progress report, October 1988--September 1991

    SciTech Connect (OSTI)

    Not Available

    1991-12-31

    Progress on the positron microscope during the past year has been steady, and we currently project that initial microscope images can be collected during mid to late summer of 1992. Work during the year has mainly been divided among four areas of effort: hardware construction; power supply and control system development; radioactive source fabrication; and planning of initial experimental projects. Details of progress in these areas will be given below. An initial optical design of the microscope was completed during 1990, but during the past year, significant improvements have been made to this design, and several limiting cases of microscope performance have been evaluated. The results of these evaluations have been extremely encouraging, giving us strong indications that the optical performance of the microscope will be better than originally anticipated. In particular, we should be able to explore ultimate performance capabilities of positron microscopy using our currently planned optical system, with improvements only in the image detector system, and the positron-source/moderator configuration. We should be able to study imaging reemission microscopy with resolutions approaching 10 {Angstrom} and be able to produce beam spots for rastered microscope work with diameters below the 1000 {Angstrom} diffusion limit. Because of these exciting new possibilities, we have decided to upgrade several microscope subsystems to levels consistent with ultimate performance earlier in our construction schedule than we had previously intended. In particular, alignment facilities in the optical system, vibration isolation, and power supply and control system flexibility have all been upgraded in their design over the past year.

  17. Mexico: swapping crude for atoms

    SciTech Connect (OSTI)

    Navarro, B.

    1982-06-24

    Mexico, considered the Saudi Arabia of the Western Hemisphere because of its proven and potential petroleum reserves, has surprised the world: it has embarked on the biggest nuclear-electric program in the Third World, only to postpone it days before scheduled approval of an international bidding (on which the atomic energy industry had pinned its hopes). A graph shows Mexican supplies of electricity by source with official projections to 1990. The point of entrance of the first nuclear reactor, originally scheduled for 1982, won't come onstream until 1983; and how nuclear-generated electricity grows close to 5% of the total in 1990. The big question is, will the future President of Mexico give the green light to the atomic megaproject. And if he does, how will Mexico deal with the serious logistics problems and grave ecological implications confronting the industry worldwide. In this issue, the author and Energy Detente touch on these questions and review the nuclear power status of Mexico, as well as addressing some of its global problems. Also presented in this issue is an update of the fuel price/tax series for the Western Hemisphere countries.

  18. Demonstration of achromatic cold-neutron microscope utilizing axisymmetric focusing mirrors

    SciTech Connect (OSTI)

    Liu, D.; Khaykovich, B. [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States)] [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States); Hussey, D.; Jacobson, D.; Arif, M. [Physical Measurement Laboratory, NIST, Gaithersburg, Maryland 20899-8461 (United States)] [Physical Measurement Laboratory, NIST, Gaithersburg, Maryland 20899-8461 (United States); Gubarev, M. V.; Ramsey, B. D. [Marshall Space Flight Center, NASA, VP62, Huntsville, Alabama 35812 (United States)] [Marshall Space Flight Center, NASA, VP62, Huntsville, Alabama 35812 (United States); Moncton, D. E. [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States) [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States); Department of Physics, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, Massachusetts 02139 (United States)

    2013-05-06

    An achromatic cold-neutron microscope with magnification 4 is demonstrated. The image-forming optics is composed of nested coaxial mirrors of full figures of revolution, so-called Wolter optics. The spatial resolution, field of view, and depth of focus are measured and found consistent with ray-tracing simulations. Methods of increasing the resolution and magnification are discussed, as well as the scientific case for the neutron microscope. In contrast to traditional pinhole-camera neutron imaging, the resolution of the microscope is determined by the mirrors rather than by the collimation of the beam, leading to possible dramatic improvements in the signal rate and resolution.

  19. Truman Signs Atomic Energy Act | National Nuclear Security Administration |

    National Nuclear Security Administration (NNSA)

    (NNSA) Truman Signs Atomic Energy Act Truman Signs Atomic Energy Act Washington, DC President Truman signs the Atomic Energy Act of 1946, leading to the creation of the Atomic Energy Commission

  20. Authorize_Changes_Contractor_Work_Force_Restructuring_Policy...

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    AuthorizeChangesContractorWorkForceRestructuringPolicy.pdf AuthorizeChangesContractorWorkForceRestructuringPolicy.pdf PDF icon AuthorizeChangesContractorWorkForceR...

  1. Integrated atomistic chemical imaging and reactive force field molecular dynamic simulations on silicon oxidation

    SciTech Connect (OSTI)

    Dumpala, Santoshrupa; Broderick, Scott R.; Rajan, Krishna; Khalilov, Umedjon; Neyts, Erik C.; Duin, Adri C. T. van; Provine, J; Howe, Roger T.

    2015-01-05

    In this paper, we quantitatively investigate with atom probe tomography, the effect of temperature on the interfacial transition layer suboxide species due to the thermal oxidation of silicon. The chemistry at the interface was measured with atomic scale resolution, and the changes in chemistry and intermixing at the interface were identified on a nanometer scale. We find an increase of suboxide (SiOx) concentration relative to SiO{sub 2} and increased oxygen ingress with elevated temperatures. Our experimental findings are in agreement with reactive force field molecular dynamics simulations. This work demonstrates the direct comparison between atom probe derived chemical profiles and atomistic-scale simulations for transitional interfacial layer of suboxides as a function of temperature.

  2. Casimir force between integrable and chaotic pistons

    SciTech Connect (OSTI)

    Alvarez, Ezequiel; Mazzitelli, Francisco D.; Wisniacki, Diego A. [Departamento de Fisica, Facultad de Ciencias Exactas y Naturales Universidad de Buenos Aires, and Instituto de Fisica de Buenos Aires, Concejo Nacional de Investigaciones Cientificas y Tecnicas, Ciudad Universitaria, Pabellon I, 1428 Buenos Aires (Argentina); Monastra, Alejandro G. [Gerencia de Investigacion y Aplicaciones, Comision Nacional de Energia Atomica, Concejo Nacional de Investigaciones Cientificas y Tecnicas, Avenida General Paz 1499, 1650 San Martin (Argentina)

    2010-11-15

    We have computed numerically the Casimir force between two identical pistons inside a very long cylinder, considering different shapes for the pistons. The pistons can be considered quantum billiards, whose spectrum determines the vacuum force. The smooth part of the spectrum fixes the force at short distances and depends only on geometric quantities like the area or perimeter of the piston. However, correcting terms to the force, coming from the oscillating part of the spectrum which is related to the classical dynamics of the billiard, could be qualitatively different for classically integrable or chaotic systems. We have performed a detailed numerical analysis of the corresponding Casimir force for pistons with regular and chaotic classical dynamics. For a family of stadium billiards, we have found that the correcting part of the Casimir force presents a sudden change in the transition from regular to chaotic geometries. This suggests that there could be signatures of quantum chaos in the Casimir effect.

  3. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Wild 2 Viewed by ALS Microscopes Print NASA's 200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81PWild...

  4. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81PWild 2 Viewed by ALS Microscopes Print NASA's 200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the...

  5. Comet 81P/Wild 2 Under a Microscope (Journal Article) | SciTech...

    Office of Scientific and Technical Information (OSTI)

    Journal Article: Comet 81PWild 2 Under a Microscope Citation Details In-Document Search Title: Comet ... Publication Date: 2007-01-16 OSTI Identifier: 897746 Report Number(s): ...

  6. The Manhattan Project: Making the Atomic Bomb | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    The Manhattan Project: Making the Atomic Bomb The Manhattan Project: Making the Atomic Bomb This report is an account of work on the atomic bomb. The Manhattan Project: Making the Atomic Bomb (6.17 MB) More Documents & Publications Gosling, The Manhattan Project: Making the Atomic Bomb The_Manhattan_Project_2010.pdf The Manhattan Project: Making of the Atomic Bomb

  7. Protective Forces | National Nuclear Security Administration | (NNSA)

    National Nuclear Security Administration (NNSA)

    Protective Forces NNSA has some of the best trained and best equipped forces protecting its nuclear weapons and material. Since the events of September 11, 2001, NNSA has hired additional armed security police officers. It has also shifted towards a paramilitary, "tactical response force" that utilizes a robust mix of offensive and defensive qualified officers who are well-trained in small team and weapons tactics. It has improved its training capabilities by expanding training ranges

  8. ARM - PI Product - Direct Aerosol Forcing Uncertainty

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ProductsDirect Aerosol Forcing Uncertainty ARM Data Discovery Browse Data Comments? We would love to hear from you! Send us a note below or call us at 1-888-ARM-DATA. Send PI Product : Direct Aerosol Forcing Uncertainty Understanding sources of uncertainty in aerosol direct radiative forcing (DRF), the difference in a given radiative flux component with and without aerosol, is essential to quantifying changes in Earth's radiation budget. We examine the uncertainty in DRF due to measurement

  9. Method for enhanced atomization of liquids

    DOE Patents [OSTI]

    Thompson, Richard E.; White, Jerome R.

    1993-01-01

    In a process for atomizing a slurry or liquid process stream in which a slurry or liquid is passed through a nozzle to provide a primary atomized process stream, an improvement which comprises subjecting the liquid or slurry process stream to microwave energy as the liquid or slurry process stream exits the nozzle, wherein sufficient microwave heating is provided to flash vaporize the primary atomized process stream.

  10. Atomicity violation detection using access interleaving invariants

    DOE Patents [OSTI]

    Zhou, Yuanyuan; Lu, Shan; Tucek, Joseph Andrew

    2013-09-10

    During execution of a program, the situation where the atomicity of a pair of instructions that are to be executed atomically is violated is identified, and a bug is detected as occurring in the program at the pair of instructions. The pairs of instructions that are to be executed atomically can be identified in different manners, such as by executing a program multiple times and using the results of those executions to automatically identify the pairs of instructions.

  11. Integrated Nanosystems for Atomically Precise Manufacturing Workshop -

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    August 5-6, 2015 | Department of Energy Nanosystems for Atomically Precise Manufacturing Workshop - August 5-6, 2015 Integrated Nanosystems for Atomically Precise Manufacturing Workshop - August 5-6, 2015 The US Department of Energy (DOE) Advanced Manufacturing Office (AMO) hosted a Workshop on Integrated Nanosystems for Atomically Precise Manufacturing (INFAPM) in Berkeley, California, August 5-6, 2015. DOE invited representatives from academia, national labs, the Executive Office of the

  12. Collisionally induced atomic clock shifts and correlations

    SciTech Connect (OSTI)

    Band, Y. B.; Osherov, I.

    2011-07-15

    We develop a formalism to incorporate exchange symmetry considerations into the calculation of collisional frequency shifts for atomic clocks using a density-matrix formalism. The formalism is developed for both fermionic and bosonic atomic clocks. Numerical results for a finite-temperature {sup 87}Sr {sup 1}S{sub 0} (F=9/2) atomic clock in a magic wavelength optical lattice are presented.

  13. NNSA & DOE Employees Use Tiny Smartphone Microscopes to Teach STEM |

    National Nuclear Security Administration (NNSA)

    National Nuclear Security Administration | (NNSA) & DOE Employees Use Tiny Smartphone Microscopes to Teach STEM Wednesday, January 27, 2016 - 12:31pm NNSA Blog Users discovered items the device could magnify, such as yarn, human hair, and flower petals. Employees lunching on Friday, January 15, in the Department of Energy headquarters cafeteria received smartphone microscopes and a mission: Engage five students over Martin Luther King Jr. Day of Service in a STEM conversation using the

  14. Fragment Yields Calculated in a Time-Dependent Microscopic Theory of

    Office of Scientific and Technical Information (OSTI)

    Fission (Technical Report) | SciTech Connect Fragment Yields Calculated in a Time-Dependent Microscopic Theory of Fission Citation Details In-Document Search Title: Fragment Yields Calculated in a Time-Dependent Microscopic Theory of Fission Authors: Younes, W ; Gogny, D Publication Date: 2012-09-28 OSTI Identifier: 1053671 Report Number(s): LLNL-TR-586678 DOE Contract Number: W-7405-ENG-48 Resource Type: Technical Report Research Org: Lawrence Livermore National Laboratory (LLNL),

  15. Geek-Up[6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy 6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes Geek-Up[6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes June 3, 2011 - 2:04pm Addthis Novartis Diagnostics scientist Cleo Salisbury and Biological Nanostructures Facility director Ron Zuckermann discuss their collaboration to discover new therapies for Alzheimer's. Niketa Kumar Niketa Kumar Public Affairs Specialist, Office of Public Affairs What does this mean for me? Researchers have developed new

  16. Two-band description of resonant superfluidity in atomic Fermi gases

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    He, Lianyi; Hu, Hui; Liu, Xia -Ji

    2015-02-23

    Fermionic superfluidity in atomic Fermi gases across a Feshbach resonance is normally described by the atom-molecule theory, which treats the closed channel as a noninteracting point boson. In this work we present a theoretical description of the resonant superfluidity in analogy to the two-band superconductors. We employ the underlying two-channel scattering model of Feshbach resonance where the closed channel is treated as a composite boson with binding energy ε0 and the resonance is triggered by the microscopic interchannel coupling U12. The binding energy ε0 naturally serves as an energy scale of the system, which has been sent to infinity inmore » the atom-molecule theory. We show that the atom-molecule theory can be viewed as a leading-order low-energy effective theory of the underlying fermionic theory in the limit ε0→∞ and U12→0, while keeping the phenomenological atom-molecule coupling finite. The resulting two-band description of the superfluid state is in analogy to the BCS theory of two-band superconductors. In the dilute limit ε0→∞, the two-band description recovers precisely the atom-molecule theory. The two-band theory provides a natural approach to study the corrections because of a finite binding energy ε0 in realistic experimental systems. For broad and moderate resonances, the correction is not important for current experimental densities. However, for extremely narrow resonance, we find that the correction becomes significant. Lastly, the finite binding energy correction could be important for the stability of homogeneous polarized superfluid against phase separation in imbalanced Fermi gases across a narrow Feshbach resonance.« less

  17. Piezoresponse Force Microscopy: A Window into Electromechanical...

    Office of Scientific and Technical Information (OSTI)

    Behavior at the Nanoscale Citation Details In-Document Search Title: Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Authors: Bonnell, ...

  18. Sandia Energy - Air Force Research Laboratory Testing

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    from the Air Force Research Laboratory in Albuquerque utilized the site at the National Solar Thermal Test Facility to evaluate seismic and optical activity from explosives set...

  19. Sandia Energy - Air Force Research Laboratory Testing

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    the Air Force Research Laboratory (AFRL) in Albuquerque utilized the site at the National Solar Thermal Test Facility (NSTTF) to evaluate seismic and optical activity from...

  20. Weardale Task Force | Open Energy Information

    Open Energy Info (EERE)

    that is developing a sustainable community in the East gate area which will be run on wind, solar, biomass, geothermal and hydro power. References: Weardale Task Force1...

  1. Nuclear Radiological Threat Task Force Established | National...

    National Nuclear Security Administration (NNSA)

    Nuclear Radiological Threat Task Force Established Washington, DC NNSA's Administrator Linton Brooks announces the establishment of the Nuclear Radiological Threat Reduction Task ...

  2. Interagency Energy Management Task Force Members

    Broader source: Energy.gov [DOE]

    The Interagency Energy Management Task Force is led by the Federal Energy Management Program director. Members include energy and sustainability managers from federal agencies.

  3. Elastic actuator for precise force control

    DOE Patents [OSTI]

    Pratt, G.A.; Williamson, M.M.

    1997-07-22

    The invention provides an elastic actuator consisting of a motor and a motor drive transmission connected at an output of the motor. An elastic element is connected in series with the motor drive transmission, and this elastic element is positioned to alone support the full weight of any load connected at an output of the actuator. A single force transducer is positioned at a point between a mount for the motor and an output of the actuator. This force transducer generates a force signal, based on deflection of the elastic element, that indicates force applied by the elastic element to an output of the actuator. An active feedback force control loop is connected between the force transducer and the motor for controlling the motor. This motor control is based on the force signal to deflect the elastic element an amount that produces a desired actuator output force. The produced output force is substantially independent of load motion. The invention also provides a torsional spring consisting of a flexible structure having at least three flat sections each connected integrally with and extending radially from a central section. Each flat section extends axially along the central section from a distal end of the central section to a proximal end of the central section. 30 figs.

  4. Elastic actuator for precise force control

    DOE Patents [OSTI]

    Pratt, Gill A.; Williamson, Matthew M.

    1997-07-22

    The invention provides an elastic actuator consisting of a motor and a motor drive transmission connected at an output of the motor. An elastic element is connected in series with the motor drive transmission, and this elastic element is positioned to alone support the full weight of any load connected at an output of the actuator. A single force transducer is positioned at a point between a mount for the motor and an output of the actuator. This force transducer generates a force signal, based on deflection of the elastic element, that indicates force applied by the elastic element to an output of the actuator. An active feedback force control loop is connected between the force transducer and the motor for controlling the motor. This motor control is based on the force signal to deflect the elastic element an amount that produces a desired actuator output force. The produced output force is substantially independent of load motion. The invention also provides a torsional spring consisting of a flexible structure having at least three flat sections each connected integrally with and extending radially from a central section. Each flat section extends axially along the central section from a distal end of the central section to a proximal end of the central section.

  5. Calculating Atomic Number Densities for Uranium

    Energy Science and Technology Software Center (OSTI)

    1993-01-01

    Provides method to calculate atomic number densities of selected uranium compounds and hydrogenous moderators for use in nuclear criticality safety analyses at gaseous diffusion uranium enrichment facilities.

  6. Atomic Scale Characterization of Compound Semiconductors using...

    Office of Scientific and Technical Information (OSTI)

    more fundamental understanding of carrier dynamics in photovoltaic (PV) device structures. ... Applying these improved analysis conditions to III-V based PV gives an atomic scale ...

  7. Manhattan Project: Adventures Inside the Atom

    Office of Scientific and Technical Information (OSTI)

    This publication was produced at the request of the the Assistant Manager for Public Education, Oak Ridge Operations Office, Atomic Energy Commission. It is reproduced here via the ...

  8. Circuits of Atoms on Wires of Light

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Circuits of Atoms on Wires of Light 1663 Los Alamos science and technology magazine Latest Issue:July 2016 past issues All Issues » submit Circuits of Atoms on Wires of Light A new kind of circuitry-with electrons on conducting wires replaced by atoms on paths of laser light-is ushering in an era of "atomtronic" technology. March 8, 2016 Artist visualization of atomic circuits Los Alamos scientists have developed a reliable new way to create atomtronic circuits with waves of

  9. Atomic Scale Characterization of Compound Semiconductors using...

    Office of Scientific and Technical Information (OSTI)

    Country of Publication: United States Language: English Subject: 14 SOLAR ENERGY; 36 MATERIALS SCIENCE; ALLOYS; ATOMS; DATA ACQUISITION; DIFFUSION; FUNCTIONALS; HEAT FLUX; ...

  10. Optimizing Atomic Neighborhoods for Speedier Chemical Reactions...

    Office of Science (SC) Website

    processes involved in energy production and pollution control. Employing in-operation tools to atomic-level interactions in palladium-based catalysts enhances the discovery and...

  11. Atom-split it for nuclear energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    adjustments were provided by the 'Calutron Girls' Seaborg-Chairman of the Atomic Energy Commission 1961-1971; discovered many elements Buckyball-Buckminsterfullerene; 60...

  12. CERTIFICATION DOCKET WESTINGHOUSE ATOMIC POWER DEVELOPMENT PLANT

    Office of Legacy Management (LM)

    ... A survey cf the area of the "L' Building was performed and consisted of gamma-ray ... - Statement of Certification Westinghouse Atomic Power Development Plant East Pittsburgh ...

  13. A transferable force field for CdS-CdSe-PbS-PbSe solid systems

    SciTech Connect (OSTI)

    Fan, Zhaochuan; Vlugt, Thijs J. H.; Koster, Rik S.; Fang, Changming; Huis, Marijn A. van; Wang, Shuaiwei; Yalcin, Anil O.; Tichelaar, Frans D.; Zandbergen, Henny W.

    2014-12-28

    A transferable force field for the PbSe-CdSe solid system using the partially charged rigid ion model has been successfully developed and was used to study the cation exchange in PbSe-CdSe heteronanocrystals [A. O. Yalcin et al., “Atomic resolution monitoring of cation exchange in CdSe-PbSe heteronanocrystals during epitaxial solid-solid-vapor growth,” Nano Lett. 14, 3661–3667 (2014)]. In this work, we extend this force field by including another two important binary semiconductors, PbS and CdS, and provide detailed information on the validation of this force field. The parameterization combines Bader charge analysis, empirical fitting, and ab initio energy surface fitting. When compared with experimental data and density functional theory calculations, it is shown that a wide range of physical properties of bulk PbS, PbSe, CdS, CdSe, and their mixed phases can be accurately reproduced using this force field. The choice of functional forms and parameterization strategy is demonstrated to be rational and effective. This transferable force field can be used in various studies on II-VI and IV-VI semiconductor materials consisting of CdS, CdSe, PbS, and PbSe. Here, we demonstrate the applicability of the force field model by molecular dynamics simulations whereby transformations are initiated by cation exchange.

  14. Muon Collider Task Force Report

    SciTech Connect (OSTI)

    Ankenbrandt, C.; Alexahin, Y.; Balbekov, V.; Barzi, E.; Bhat, C.; Broemmelsiek, D.; Bross, A.; Burov, A.; Drozhdin, A.; Finley, D.; Geer, S.; /Fermilab /Argonne /Brookhaven /Jefferson Lab /LBL, Berkeley /MUONS Inc., Batavia /UCLA /UC, Riverside /Mississippi U.

    2007-12-01

    Muon Colliders offer a possible long term path to lepton-lepton collisions at center-of-mass energies {radical}s {ge} 1 TeV. In October 2006 the Muon Collider Task Force (MCTF) proposed a program of advanced accelerator R&D aimed at developing the Muon Collider concept. The proposed R&D program was motivated by progress on Muon Collider design in general, and in particular, by new ideas that have emerged on muon cooling channel design. The scope of the proposed MCTF R&D program includes muon collider design studies, helical cooling channel design and simulation, high temperature superconducting solenoid studies, an experimental program using beams to test cooling channel RF cavities and a 6D cooling demonstration channel. The first year of MCTF activities are summarized in this report together with a brief description of the anticipated FY08 R&D activities. In its first year the MCTF has made progress on (1) Muon Collider ring studies, (2) 6D cooling channel design and simulation studies with an emphasis on the HCC scheme, (3) beam preparations for the first HPRF cavity beam test, (4) preparations for an HCC four-coil test, (5) further development of the MANX experiment ideas and studies of the muon beam possibilities at Fermilab, (6) studies of how to integrate RF into an HCC in preparation for a component development program, and (7) HTS conductor and magnet studies to prepare for an evaluation of the prospects for of an HTS high-field solenoid build for a muon cooling channel.

  15. Atom-diatom scattering dynamics of spinning molecules

    SciTech Connect (OSTI)

    Eyles, C. J.; Flo, J.; Averbukh, I. Sh.; Leibscher, M.

    2015-01-14

    We present full quantum mechanical scattering calculations using spinning molecules as target states for nuclear spin selective atom-diatom scattering of reactive D+H{sub 2} and F+H{sub 2} collisions. Molecules can be forced to rotate uni-directionally by chiral trains of short, non-resonant laser pulses, with different nuclear spin isomers rotating in opposite directions. The calculations we present are based on rotational wavepackets that can be created in this manner. As our simulations show, target molecules with opposite sense of rotation are predominantly scattered in opposite directions, opening routes for spatially and quantum state selective scattering of close chemical species. Moreover, two-dimensional state resolved differential cross sections reveal detailed information about the scattering mechanisms, which can be explained to a large degree by a classical vector model for scattering with spinning molecules.

  16. Thermal Casimir-Polder shifts in Rydberg atoms near metallic surfaces

    SciTech Connect (OSTI)

    Crosse, J. A.; Clements, Kate; Buhmann, Stefan Y.; Scheel, Stefan; Ellingsen, Simen A.

    2010-07-15

    The Casimir-Polder (CP) potential and transition rates of a Rydberg atom above a plane metal surface at finite temperature are discussed. As an example, the CP potential and transition rates of a rubidium atom above a copper surface at 300 K are computed. Close to the surface we show that the quadrupole correction to the force is significant and increases with increasing principal quantum number n. For both the CP potential and decay rates one finds that the dominant contribution comes from the longest wavelength transition and the potential is independent of temperature. We provide explicit scaling laws for potential and decay rates as functions of atom-surface distance and principal quantum number of the initial Rydberg state.

  17. Conduction of molecular electronic devices: Qualitative insights through atom-atom polarizabilities

    SciTech Connect (OSTI)

    Stuyver, T.; Fias, S. De Proft, F.; Geerlings, P.; Fowler, P. W.

    2015-03-07

    The atom-atom polarizability and the transmission probability at the Fermi level, as obtained through the source-and-sink-potential method for every possible configuration of contacts simultaneously, are compared for polycyclic aromatic compounds. This comparison leads to the conjecture that a positive atom-atom polarizability is a necessary condition for transmission to take place in alternant hydrocarbons without non-bonding orbitals and that the relative transmission probability for different configurations of the contacts can be predicted by analyzing the corresponding atom-atom polarizability. A theoretical link between the two considered properties is derived, leading to a mathematical explanation for the observed trends for transmission based on the atom-atom polarizability.

  18. Sub-Angstrom Atomic-Resolution Imaging of Heavy Atoms to Light...

    Office of Scientific and Technical Information (OSTI)

    of Heavy Atoms to Light Atoms Citation Details In-Document Search ... Publication Date: 2003-05-23 OSTI Identifier: 822959 Report Number(s): LBNL--52090 Journal ID: ISSN ...

  19. A 350 mK, 9 T scanning tunneling microscope for the study of superconducting thin films on insulating substrates and single crystals

    SciTech Connect (OSTI)

    Kamlapure, Anand; Saraswat, Garima; Ganguli, Somesh Chandra; Bagwe, Vivas; Raychaudhuri, Pratap; Pai, Subash P.

    2013-12-15

    We report the construction and performance of a low temperature, high field scanning tunneling microscope (STM) operating down to 350 mK and in magnetic fields up to 9 T, with thin film deposition and in situ single crystal cleaving capabilities. The main focus lies on the simple design of STM head and a sample holder design that allows us to get spectroscopic data on superconducting thin films grown in situ on insulating substrates. Other design details on sample transport, sample preparation chamber, and vibration isolation schemes are also described. We demonstrate the capability of our instrument through the atomic resolution imaging and spectroscopy on NbSe{sub 2} single crystal and spectroscopic maps obtained on homogeneously disordered NbN thin film.

  20. armed forces | National Nuclear Security Administration

    National Nuclear Security Administration (NNSA)

    armed forces CNS employees greet Honor Air veterans Y-12 Deputy Site Manager Gene Sievers, left, and ProForce's Neal Wolfenbarger pose for photo at McGhee Tyson Airport in Knoxville, TN, as Wolfenbarger waits on his uncle to return from Washington, D.C. Veterans Day is important to all Americans, but it carries an even more elevated meaning to those

  1. Atomic magnetometer for human magnetoencephalograpy.

    SciTech Connect (OSTI)

    Schwindt, Peter; Johnson, Cort N.

    2010-12-01

    We have developed a high sensitivity (<5 fTesla/{radical}Hz), fiber-optically coupled magnetometer to detect magnetic fields produced by the human brain. This is the first demonstration of a noncryogenic sensor that could replace cryogenic superconducting quantum interference device (SQUID) magnetometers in magnetoencephalography (MEG) and is an important advance in realizing cost-effective MEG. Within the sensor, a rubidium vapor is optically pumped with 795 laser light while field-induced optical rotations are measured with 780 nm laser light. Both beams share a single optical axis to maximize simplicity and compactness. In collaboration with neuroscientists at The Mind Research Network in Albuquerque, NM, the evoked responses resulting from median nerve and auditory stimulation were recorded with the atomic magnetometer and a commercial SQUID-based MEG system with signals comparing favorably. Multi-sensor operation has been demonstrated with two AMs placed on opposite sides of the head. Straightforward miniaturization would enable high-density sensor arrays for whole-head magnetoencephalography.

  2. Atomic Layer Deposition | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Atomic Layer Deposition New nanophase thin film materials with properties tailored to specifically meet the needs of industry New software simulates ALD over multiple length scale, saving industry time and money on developing specialized tools PDF icon Atomic_Layer_Deposition

  3. Measurement of tool forces in diamond turning

    SciTech Connect (OSTI)

    Drescher, J.; Dow, T.A.

    1988-12-01

    A dynamometer has been designed and built to measure forces in diamond turning. The design includes a 3-component, piezoelectric transducer. Initial experiments with this dynamometer system included verification of its predicted dynamic characteristics as well as a detailed study of cutting parameters. Many cutting experiments have been conducted on OFHC Copper and 6061-T6 Aluminum. Tests have involved investigation of velocity effects, and the effects of depth and feedrate on tool forces. Velocity has been determined to have negligible effects between 4 and 21 m/s. Forces generally increase with increasing depth of cut. Increasing feedrate does not necessarily lead to higher forces. Results suggest that a simple model may not be sufficient to describe the forces produced in the diamond turning process.

  4. A continuous cold atomic beam interferometer

    SciTech Connect (OSTI)

    Xue, Hongbo; Feng, Yanying Yan, Xueshu; Jiang, Zhikun; Chen, Shu; Wang, Xiaojia; Zhou, Zhaoying

    2015-03-07

    We demonstrate an atom interferometer that uses a laser-cooled continuous beam of {sup 87}Rb atoms having velocities of 10–20 m/s. With spatially separated Raman beams to coherently manipulate the atomic wave packets, Mach–Zehnder interference fringes are observed at an interference distance of 2L = 19 mm. The apparatus operates within a small enclosed area of 0.07 mm{sup 2} at a bandwidth of 190 Hz with a deduced sensitivity of 7.8×10{sup −5} rad/s/√(Hz) for rotations. Using a low-velocity continuous atomic source in an atom interferometer enables high sampling rates and bandwidths without sacrificing sensitivity and compactness, which are important for applications in real dynamic environments.

  5. High data rate atom interferometric device

    SciTech Connect (OSTI)

    Biedermann, Grant; McGuinness, Hayden James Evans; Rakholia, Akash

    2015-07-21

    A light-pulse atomic interferometry (LPAI) apparatus is provided. The LPAI apparatus comprises a vessel, two sets of magnetic coils configured to magnetically confine an atomic vapor in two respective magneto-optical traps (MOTs) within the vessel when activated, and an optical system configured to irradiate the atomic vapor within the vessel with laser radiation that, when suitably tuned, can launch atoms previously confined in each of the MOTs toward the other MOT. In embodiments, the magnetic coils are configured to produce a magnetic field that is non-zero at the midpoint between the traps. In embodiments, the time-of-flight of the launched atoms from one MOT to the other is 12 ms or less. In embodiments, the MOTs are situated approximately 36 mm apart. In embodiments, the apparatus is configured to activate the magnetic coils according to a particular temporal magnetic field gradient profile.

  6. air force | National Nuclear Security Administration

    National Nuclear Security Administration (NNSA)

    air force NNSA, Air Force Complete Successful B61-12 Life Extension Program Development Flight Test at Tonopah Test Range WASHINGTON - The National Nuclear Security Administration (NNSA) and United States Air Force completed the third development flight test of a non-nuclear B61-12 nuclear gravity bomb at Tonopah Test Range in Nevada on October 20, 2015. "This demonstration of effective end-to-end system... The man who trains everyone on the bombs Mark Meyer, training coordinator and field

  7. Atomic-scale imaging and electronic structure determination of catalytic sites on Pd/Cu near surface alloys

    SciTech Connect (OSTI)

    Tierney, H.L.; Baber, A.E.; Sykes, E.C.H.

    2009-04-15

    Water-gas shift chemistry provides a useful method for producing hydrogen from coal; however, fuel cell applications demand that this hydrogen be free of impurities. Due to their unique properties, Pd/Cu alloys represent an import class of materials used for H purification membranes and also serve as the active metals in many heterogeneous catalysts. Little is known about how Pd and Cu interact electronically in these mixed systems and there is debate in the literature over the direction of charge transfer between the two species. This study used the differential conductance (dI/dV) spectroscopy capabilities of a low-temperature scanning tunneling microscope (STM) to investigate the atomic-scale electronic structure of Pd/Cu surface alloys. dI/dV spectroscopy gives a direct measure of the local density of states of surface sites with subnanometer precision. Results from this work demonstrate that individual, isolated Pd atoms in a Cu lattice are almost electronically identical to their host atoms. Over an energy range that spans 1 eV on either side of the Fermi level, the only significant electronic difference between isolated Pd and their host Cu atoms is that Pd atoms have a very slightly depleted electron density in the region of the Cu surface state maximum.

  8. Accelerating Atomic Orbital-based Electronic Structure Calculation via Pole Expansion plus Selected Inversion

    SciTech Connect (OSTI)

    Lin, Lin; Chen, Mohan; Yang, Chao; He, Lixin

    2012-02-10

    We describe how to apply the recently developed pole expansion plus selected inversion (PEpSI) technique to Kohn-Sham density function theory (DFT) electronic structure calculations that are based on atomic orbital discretization. We give analytic expressions for evaluating charge density, total energy, Helmholtz free energy and atomic forces without using the eigenvalues and eigenvectors of the Kohn-Sham Hamiltonian. We also show how to update the chemical potential without using Kohn-Sham eigenvalues. The advantage of using PEpSI is that it has a much lower computational complexity than that associated with the matrix diagonalization procedure. We demonstrate the performance gain by comparing the timing of PEpSI with that of diagonalization on insulating and metallic nanotubes. For these quasi-1D systems, the complexity of PEpSI is linear with respect to the number of atoms. This linear scaling can be observed in our computational experiments when the number of atoms in a nanotube is larger than a few hundreds. Both the wall clock time and the memory requirement of PEpSI is modest. This makes it even possible to perform Kohn-Sham DFT calculations for 10,000-atom nanotubes on a single processor. We also show that the use of PEpSI does not lead to loss of accuracy required in a practical DFT calculation.

  9. The Manhattan Project: Making the atomic bomb

    SciTech Connect (OSTI)

    Gosling, F.G.

    1994-09-01

    This article is a short history of the origins and development of the American atomic bomb program during World War II. Beginning with the scientific developments of the pre-war years, the monograph details the role of US government in conducting a secret, nationwide enterprise that took science from the laboratory and into combat with an entirely new type of weapon. The monograph concludes with a discussion of the immediate postwar period, the debate over the Atomic Energy Act of 1946, and the founding of the Atomic Energy Commission.

  10. 1982 bibliography of atomic and molecular processes

    SciTech Connect (OSTI)

    Barnett, C.F.; Crandall, D.H.; Gilbody, H.B.; Gregory, D.C.; Kirkpatrick, M.I.; McDaniel, E.W.; McKnight, R.H.; Meyer, F.W.; Morgan, T.J.; Phaneuf, R.A.

    1984-05-01

    This annotated bibliography includes papers on atomic and molecular processes published during 1982. Sources include scientific journals, conference proceedings, and books. Each entry is designated by one or more of the 114 categories of atomic and molecular processes used by the Controlled Fusion Atomic Data Center, Oak Ridge National Laboratory to classify data. Also indicated is whether the work was experimental or theoretical, what energy range was covered, what reactants were investigated, and the country of origin of the first author. Following the bibliographical listing, the entries are indexed according to the categories and according to reactants within each subcategory.

  11. Direct measurement of optical force induced by near-field plasmonic cavity using dynamic mode AFM

    SciTech Connect (OSTI)

    Guan, Dongshi; Hang, Zhi Hong; Marset, Zsolt; Liu, Hui; Kravchenko, Ivan I.; Chan, Ho Bun; Chan, C. T.; Tong, Penger

    2015-11-20

    Plasmonic nanostructures have attracted much attention in recent years because of their potential applications in optical manipulation through near-field enhancement. Continuing experimental efforts have been made to develop accurate techniques to directly measure the near-field optical force induced by the plasmonic nanostructures in the visible frequency range. In this work, we report a new application of dynamic mode atomic force microscopy (DM-AFM) in the measurement of the enhanced optical force acting on a nano-structured plasmonic resonant cavity. The plasmonic cavity is made of an upper gold-coated glass sphere and a lower quartz substrate patterned with an array of subwavelength gold disks. In the near-field when the sphere is positioned close to the disk array, plasmonic resonance is excited in the cavity and the induced force by a 1550 nm infrared laser is found to be increased by an order of magnitude compared with the photon pressure generated by the same laser light. Lastly, the experiment demonstrates that DM-AFM is a powerful tool for the study of light induced forces and their enhancement in plasmonic nanostructures.

  12. Direct measurement of optical force induced by near-field plasmonic cavity using dynamic mode AFM

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Guan, Dongshi; Hang, Zhi Hong; Marset, Zsolt; Liu, Hui; Kravchenko, Ivan I.; Chan, Ho Bun; Chan, C. T.; Tong, Penger

    2015-11-20

    Plasmonic nanostructures have attracted much attention in recent years because of their potential applications in optical manipulation through near-field enhancement. Continuing experimental efforts have been made to develop accurate techniques to directly measure the near-field optical force induced by the plasmonic nanostructures in the visible frequency range. In this work, we report a new application of dynamic mode atomic force microscopy (DM-AFM) in the measurement of the enhanced optical force acting on a nano-structured plasmonic resonant cavity. The plasmonic cavity is made of an upper gold-coated glass sphere and a lower quartz substrate patterned with an array of subwavelength goldmore » disks. In the near-field when the sphere is positioned close to the disk array, plasmonic resonance is excited in the cavity and the induced force by a 1550 nm infrared laser is found to be increased by an order of magnitude compared with the photon pressure generated by the same laser light. Lastly, the experiment demonstrates that DM-AFM is a powerful tool for the study of light induced forces and their enhancement in plasmonic nanostructures.« less

  13. SCM Forcing Data Derived from NWP Analyses

    DOE Data Explorer [Office of Scientific and Technical Information (OSTI)]

    Jakob, Christian

    2008-01-15

    Forcing data, suitable for use with single column models (SCMs) and cloud resolving models (CRMs), have been derived from NWP analyses for the ARM (Atmospheric Radiation Measurement) Tropical Western Pacific (TWP) sites of Manus Island and Nauru.

  14. Force 9 Energy | Open Energy Information

    Open Energy Info (EERE)

    9 Energy Jump to: navigation, search Name: Force 9 Energy Place: Amersham, United Kingdom Zip: HP7 0UT Sector: Wind energy Product: Joint owner of Abercairny windfarm development....

  15. Micromechanical apparatus for measurement of forces (Patent)...

    Office of Scientific and Technical Information (OSTI)

    deflection element (e.g. a ring or annulus) suspended above a substrate for deflection by an applied force, and one or more distance scales for optically measuring the deflection. ...

  16. Solar Trackers at Nellis Air Force Base

    Broader source: Energy.gov [DOE]

    This photograph features one of many SunPower T20 Tracker that are part of the 14.2-megawatt photovoltaic (PV) systems installed at Nellis Air Force Base in Nevada, which was the largest PV system...

  17. Clinch River MRS Task Force Recommendations

    Broader source: Energy.gov [DOE]

    The Clinch River HRS Task Force was appointed in July 1985 by the Roane County Executive and the Oak Ridge City Council to evaluate the Monitored Retrievable Storage (MRS) facility proposed by the...

  18. protective force | National Nuclear Security Administration

    National Nuclear Security Administration (NNSA)

    The Protective Force successfully completed a recent assessment by the U.S. Department of Energy's Office of Enterprise Assessments. The Pantex Plant recently hosted the U.S. ...

  19. Simulations of the quart (101-bar1)/water interface: A comparison of classical force fields, ab initi molecular dynamics, and x-ray reflectivity experiments.

    SciTech Connect (OSTI)

    Skelton, Adam; Fenter, Paul; Kubicki, James D.; Wesolowski, David J; Cummings, Peter T

    2011-01-01

    Classical molecular dynamics (CMD) simulations of the (1011) surface of quartz interacting with bulk liquid water are performed using three different classical force fields, Lopes et al., ClayFF, and CHARMM water contact angle (CWCA), and compared to ab initio molecular dynamics (AIMD) and X-ray reflectivity (XR) results. The axial densities of the water and surface atoms normal to the surface are calculated and compared to previous XR experiments. Favorable agreement is shown for all the force fields with respect to the position of the water atoms. Analyses such as the radial distribution functions between water and hydroxyl atoms and the average cosine of the angle between the water dipole vector and the normal of the surface are also calculated for each force field. Significant differences are found between the different force fields from such analyses, indicating differing descriptions of the structured water in the near vicinity of the surface. AIMD simulations are also performed to obtain the water and hydroxyl structure for comparison among the predictions of the three classical force fields to better understand which force field is most accurate. It is shown that ClayFF exhibits the best agreement with the AIMD simulations for water hydroxyl radial distribution functions, suggesting that ClayFF treats the hydrogen bonding more accurately.

  20. Direct Evidence of Lithium-Induced Atomic Ordering in Amorphous TiO2 Nanotubes

    SciTech Connect (OSTI)

    Gao, Qi; Gu, Meng; Nie, Anmin; Mashayek, Farzad; Wang, Chong M.; Odegard, Gregory M.; Shahbazian-Yassar, Reza

    2014-01-27

    In this paper, we report the first direct chemical and imaging evidence of lithium-induced atomic ordering in amorphous TiO2 nanomaterials and propose new reaction mechanisms that contradict the many works in the published literature on the lithiation behavior of these materials. The lithiation process was conducted in situ inside an atomic resolution transmission electron microscope. Our results indicate that the lithiation started with the valence reduction of Ti4+ to Ti3+ leading to a LixTiO2 intercalation compound. The continued intercalation of Li ions in TiO2 nanotubes triggered an amorphous to crystalline phase transformation. The crystals were formed as nano-islands and identified to be Li2Ti2O4 with cubic structure (a = 8.375 ). The tendency for the formation of these crystals was verified with density functional theory (DFT) simulations. The size of the crystalline islands provides a characteristic length scale (?5 nm) at which the atomic bonding configuration has been changed within a short time period. This phase transformation is associated with local inhomogeneities in Li distribution. On the basis of these observations, a new reaction mechanism is proposed to explain the first cycle lithiation behavior in amorphous TiO2 nanotubes.