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Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


1

Aberration Corrected Analytical Electron Microscope  

Science Conference Proceedings (OSTI)

... resolution scanning transmission electron microscope (STEM), where ... the beam electrons as they ... filtered transmission electron microscopy (EFTEM ...

2012-10-01T23:59:59.000Z

2

Progress on PEEM3 - An Aberration Corrected X-Ray Photoemission Electron Microscope at the ALS  

E-Print Network (OSTI)

Electron Microscope at the ALS A.A.MacDowell 1 , J.Feng 1 ,the Advanced Light Source (ALS). An electron mirror combinedat the Advanced Light Source (ALS). This limit is due to the

2006-01-01T23:59:59.000Z

3

Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope  

SciTech Connect

We demonstrate that a transmission electron microscope fitted with two spherical-aberration correctors can be operated as an energy-filtered scanning confocal electron microscope. A method for establishing this mode is described and initial results showing 3D chemical mapping with nanoscale sensitivity to height and thickness changes in a carbon film are presented. Importantly, uncorrected chromatic aberration does not limit the depth resolution of this technique and moreover performs an energy-filtering role, which is explained in terms of a combined depth and energy-loss response function.

Wang Peng; Behan, Gavin; Kirkland, Angus I.; Nellist, Peter D. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Takeguchi, Masaki; Hashimoto, Ayako; Mitsuishi, Kazutaka [National Institute for Materials Science, 3-13 Sakura, Tsukuba, 305-0003 (Japan); Shimojo, Masayuki [Advanced Science Research Laboratory, Saitama Institute of Technology, 1690 Fusaiji, Fukaya 369-0293 (Japan)

2010-05-21T23:59:59.000Z

4

In Situ Aberration-Corrected Scanning Transmission Electron ...  

Science Conference Proceedings (OSTI)

Using real-time transmission electron microscopy (TEM) at atomic resolutions should shed light into some of the fundamental questions in this field.

5

NCEM National Center for Electron Microscopy: Microscopes and...  

NLE Websites -- All DOE Office Websites (Extended Search)

I The TEAM I microscope is a double-aberration-corrected (scanning) transmission electron microscope (STEMTEM) capable of producing images with 50 pm resolution. The basic...

6

Scanning/Transmission Electron Microscopes  

NLE Websites -- All DOE Office Websites (Extended Search)

ScanningTransmission Electron Microscopes Nion UltraSTEM 60-100 dedicated aberration-corrected STEM for low- to mid-voltage operation and Enfina EELS Contact: Juan-Carlos Idrobo,...

7

Instrument Series: Microscopy Aberration-Corrected Scanning/Transmission  

NLE Websites -- All DOE Office Websites (Extended Search)

Aberration-Corrected Aberration-Corrected Scanning/Transmission Electron Microscope EMSL's aberration-corrected Titan 80-300(tm) scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials. Research Applications

8

Aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy studies of epitaxial Fe/MgO/(001)Ge heterostructures  

SciTech Connect

Aberration correction in the scanning transmission electron microscope combined with electron energy loss spectroscopy allows simultaneous mapping of the structure, the chemistry and even the electronic properties of materials in one single experiment with spatial resolutions of the order of one Angstrom. Here the authors will apply these techniques to the characterization of epitaxial Fe/MgO/(001)Ge and interfaces with possible applications for tunneling junctions, and the authors will show that epitaxial MgO films can be grown on a (001)Ge substrates by molecular beam epitaxy and how it is possible to map the chemistry of interfaces with atomic resolution. Epitaxial growth of insulator oxides on semiconductors constitutes a key issue within the field of electronics, and a considerably large effort has been devoted to harness the growth of high-k oxides on Si. Ge, due to its high electronic and hole mobility, is a very interesting alternative as a potential substrate for future high performance complementary metal-oxide-semiconductor field-effect transistors. However, a major issue is to avoid the high resistivity at the source and drain contacts ensuing from the pinning of the Fermi level at the valence-band maximum. It has been suggested that this problem could be fixed by depositing a thin insulating tunneling barrier between the Ge substrate and the metal contacts. In this case, single crystal epitaxy would represent an additional benefit, since it would lead to a reduction of interfacial defects and improved performance of the tunneling barrier. MgO has been suggested to fulfill such requisites. Furthermore, MgO has been demonstrated to be a good substrate for epitaxial growth of transition metals thin films, such as Fe and Co, thus avoiding the potential problem of chemical reactivity with Ge. In such a scenario, epitaxial deposition of high quality MgO films on Ge substrates is highly desirable. But in addition, successful epitaxial growth of MgO on a semiconductor would also constitute a plus for applications in spintronics, since the injection of a spin polarized current from a ferromagnetic electrode to a non-magnetic semiconductor requires the presence of a potential barrier. MgO represents a convenient choice because the symmetry filtering properties at the interface with transition metals would allow an efficient spin filtering effect. For this approach to succeed, a suitable semiconducting substrate where MgO can be grown epitaxially must be found. And again, while GaAs and Si have been investigated for such role, Ge has not received much attention so far. In this study the authors report on the atomic resolution characterization of high quality interfaces in Fe/MgO/(001)Ge heterostructures. The study of the defects, the inhomogeneities and the interface structure of such junctions is a must to pave the way toward future applications. For this aim, the combination of scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) is a most useful tool, since it allows these features to be probed with atomic resolution. Spherical aberration correction in the STEM allows for increased contrast, allowing even single atoms to be detected both in imaging and spectroscopy.

Gazquez Alabart, Jaume [ORNL; Varela del Arco, Maria [ORNL; Petti, D. [Politecnico di Milano; Cantoni, M. [Politecnico di Milano; Rinaldi, C. [Politecnico di Milano; Brivio, S. [Politecnico di Milano; Bertacco, R. [Politecnico di Milano

2011-01-01T23:59:59.000Z

9

The TEAM Project: What is the TEAM microscope?  

NLE Websites -- All DOE Office Websites (Extended Search)

What is the TEAM microscope? The TEAM project will construct a new generation electron microscope designed to incorporate aberration-correcting electron optics, to develop a common...

10

Transmission Electron Microscope and Scanning Electron Microscopes -  

NLE Websites -- All DOE Office Websites (Extended Search)

Facilities > Transmission Electron Facilities > Transmission Electron Microscope and Scanning Electron Microscopes FACILITIES Transmission Electron Microscope and Scanning Electron Microscopes Overview Other Facilities Work with Argonne Contact us For Employees Site Map Help Join us on Facebook Follow us on Twitter NE on Flickr Transmission Electron Microscope and Scanning Electron Microscopes The research activities of the Corrosion and Mechanics of Materials Section are supported by complete metallography/sample preparation rooms equipped with several optical and electron microscopes: a Transmission Electron Microscope and two Scanning Electron Microscopes. Bookmark and Share Transmission electron microscope (TEM) Detail of JEOL 100CXII TEM Figure 1: Detail of JEOL 100CXII TEM. Click on image to view larger image.

11

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

0.5 0.5 The TEAM 0.5 microscope is a double-aberration-corrected (scanning) transmission electron microscope (STEM/TEM) capable of producing images with 50 pm resolution. The basic instrument is a modified FEI Titan 80-300 microscope equipped with a special high-brightness Schottky-field emission electron source, a gun monochromator, a high-resolution GIF Tridiem energy-filter, and two CEOS hexapole-type spherical aberration correctors. The illumination aberration corrector corrects coherent axial aberrations up to 4th order, as well as 5th order spherical aberration and six-fold astigmatism. The imaging aberration corrector fully corrects for coherent axial aberrations up to 3rd order and partially compensates for 4th and 5th order aberrations. The microscope has two 2048x2048 slow-scan CCD

12

Aberration-Corrected Scanning Transmission Electron Microscopy ...  

Science Conference Proceedings (OSTI)

... hydrogen production by steam reforming of methanol and oxidation of CO for low ... Recent Developments in In Situ Studies of Catalytic Materials at Atomic ...

13

Scanning Confocal Electron Microscope (SCEM)  

Transmission/Scanning Transmission Electron Microscope. The SCEM enables imaging of sub-surface structures of thick, optically opaque materials, ...

14

Transmission electron microscope CCD camera  

DOE Patents (OSTI)

In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.

Downing, Kenneth H. (Lafayette, CA)

1999-01-01T23:59:59.000Z

15

Analytical Electron Microscope  

Science Conference Proceedings (OSTI)

... a conventional parallel electron energy-loss spectrometer (EELS) to record spectra of the energy losses experienced by the beam electrons as they ...

2012-10-01T23:59:59.000Z

16

Overview of Electron Microscope Interference  

Science Conference Proceedings (OSTI)

Power frequency magnetic fields can interfere with proper operation of electronic imaging systems. Electron microscopes are susceptible to deflection of their electron beam by an external magnetic field. This unwanted deflection can cause blurring of the image. MRI equipment is susceptible to induced voltage in the sensing coil caused by changing magnetic fields. In either case the result is degradation of the image. Magnetic field strengths that impact the images are on the same order of magnitude as th...

2010-05-28T23:59:59.000Z

17

Electron Tomography in Aberration-corrected Transmission Electron ...  

Science Conference Proceedings (OSTI)

P1-04: 3D Microstructural Characterization of Uranium Oxide as a Surrogate Nuclear ... P1-15: Gating System Optimisation Design Study of a Cast Automobile ... P2-27: Characterization of Carbonate Rocks through X-ray Microtomography.

18

Atomic Imaging Using Secondary Electrons in a Scanning Transmission Electron Microscope: Experimental Observations and Possible Mechanisms  

SciTech Connect

We report detailed investigation of high-resolution imaging using secondaryelectrons (SE) with a sub-nanometer probe in an aberration-corrected transmissionelectron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. Apossiblemechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization.

Su, D.; Inada, H.; Egerton, R.F.; Konno, M.; Wua, L.; Ciston, J.; Wall, J.; Zhu, Y.

2011-11-11T23:59:59.000Z

19

Available Technologies: Transmission Electron Microscope Phase ...  

Robert Glaeser and Jian Jin have developed an apparatus that can be integrated into transmission electron microscopes (TEMs) to enable high contrast imaging of weak ...

20

Nanomaterials Analysis using a Scanning Electron Microscope ...  

NLE Websites -- All DOE Office Websites (Extended Search)

Nanomaterials Analysis using a Scanning Electron Microscope Technology available for licensing: Steradian X-ray detection system increases the detection capability of SEMs during...

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


21

A Networked Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

Featured Overview. A New Paradigm—Multi-User Scanning Electron Microscopy. L.S. Chumbley, M. Meyer, K. Fredrickson, and F.C. Laabs. Introduction; System ...

22

Instrument Series: Microscopy Environmental Transmission Electron Microscope  

NLE Websites -- All DOE Office Websites (Extended Search)

Environmental Transmission Environmental Transmission Electron Microscope EMSL's environmental transmission electron microscope (ETEM) provides in situ capabilities that enable atomic-resolution imaging and spectroscopic studies of materials under dynamic operating conditions. In contrast to traditional operation of TEM under high vacuum, EMSL's ETEM uniquely allows imaging within high- temperature and gas environments-with a gas pressure up to 20 Torr. With a spherical aberration corrector for the objective lens, the ETEM captures atomic-level processes as they occur, enabling vital research across a range of scientific fields. Research Applications Chemical science and engineering - providing in situ observation of catalytic processes with atomic-level resolution Materials science and engineering - allowing

23

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

iTEAM iTEAM The in situ Transmission Electron Aberration Corrected Microscope (iTEAM) is a proposed project to develop a microscope with powerful capabilities for in situ studies of materials in their native environment. iTEAM will build on the success of the TEAM project by utilizing both spherical and chromatic aberration correction in an electron microscope to provide unprecedented capabilities to study materials in controlled environments of temperature, pressure, or fluidic states with the high-resolution in imaging, diffraction, and spectroscopy typical of electron probes. The capabilities of iTEAM will lead to new ways to understand the behavior of materials in native environments, with particular relevance to major energy initiatives such as catalysis, solar conversion, fuel cells, and batteries. In addition, iTEAM will provide new capabilities to understand organic/inorganic interfaces, functionalized nanoparticles, and biomaterials under natural conditions.

24

Ponderomotive phase plate for transmission electron microscopes  

Science Conference Proceedings (OSTI)

A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.

Reed, Bryan W. (Livermore, CA)

2012-07-10T23:59:59.000Z

25

Scanning Electron Microscope 1: Zeiss Ultra-60 FESEM  

Science Conference Proceedings (OSTI)

Scanning Electron Microscope 1: Zeiss Ultra-60 FESEM. ... Secondary and backscattered electron detectors; Images structures down to 10 nm in size; ...

2013-05-30T23:59:59.000Z

26

NCEM National Center for Electron Microscopy: Microscopes and...  

NLE Websites -- All DOE Office Websites (Extended Search)

OM The One-Angstrom Microscope (OM) is a mid-voltage transmission electron microscope (TEM) capable of producing images with sub-angstrom resolution. The basic instrument is a...

27

Electron Microscopy | Center for Functional Nanomaterials  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Facility Electron Microscopy Facility Electron Microscopy This facility consists of four top-of-the line transmission electron microscopes, two of which are highly specialized instruments capable of extreme levels of resolution, achieved through spherical aberration correction. The facility is also equipped with extensive sample-preparation capabilities. The scientific interests of the staff focus on understanding the microscopic origin of the physical and chemical behavior of materials, with specific emphasis on in-situ studies of materials in native, functional environments. Capabilities Atomic-resolution imaging of internal materials structure with scanning transmission and transmission electron microscopy Spectroscopic characterization with energy dispersive x-ray

28

Simulation and characterization of a miniaturized Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

A miniaturized Scanning Electron Microscope (mini-SEM) for in-situ lunar investigations is being developed at NASA Marshall Space Flight Center with colleagues from the University of Alabama in Huntsville (UAH), Advanced Research Systems (ARS), and the ...

Jessica. A. Gaskin; Gregory A. Jerman; Stephanie Medley; Don Gregory; Terry O. Abbott; Allen R. Sampson

2011-03-01T23:59:59.000Z

29

Basic Design of the Scanning Electron Microscope  

Science Conference Proceedings (OSTI)

...H.E. Exner and S. Weinbruch, Scanning Electron Microscopy, Metallography and Microstructures, Vol 9, ASM Handbook,

30

Simultaneous specimen and stage cleaning device for analytical electron microscope  

DOE Patents (OSTI)

An improved method and apparatus are provided for cleaning both a specimen stage, a specimen and an interior of an analytical electron microscope (AEM). The apparatus for cleaning a specimen stage and specimen comprising a plasma chamber for containing a gas plasma and an air lock coupled to the plasma chamber for permitting passage of the specimen stage and specimen into the plasma chamber and maintaining an airtight chamber. The specimen stage and specimen are subjected to a reactive plasma gas that is either DC or RF excited. The apparatus can be mounted on the analytical electron microscope (AEM) for cleaning the interior of the microscope.

Zaluzec, Nestor J. (Bolingbrook, IL)

1996-01-01T23:59:59.000Z

31

In-situ monitoring of electron beam induced deposition by atomic force microscopy in a scanning electron microscope  

Science Conference Proceedings (OSTI)

A new type of atomic force microscope is proposed for atomic force microscopic analysis inside a scanning electron microscope. We attached a piezoresisitive atomic force microscopic cantilever to a micro manipulator to achieve a compact and guidable ... Keywords: atomic force, electron beam induced deposition, in-situ monitoring, local gas injection, micro manipulator, microscope

S. Bauerdick; C. Burkhardt; R. Rudorf; W. Barth; V. Bucher; W. Nisch

2003-06-01T23:59:59.000Z

32

Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes  

Science Conference Proceedings (OSTI)

A new highly efficient design for semiconductor detectors of intermediate-energy electrons (1-50 keV) for application in scanning electron microscopes is proposed. Calculations of the response function of advanced detectors and control experiments show that the efficiency of the developed devices increases on average twofold, which is a significant positive factor in the operation of modern electron microscopes in the mode of low currents and at low primary electron energies.

Rau, E. I. [Moscow State University (Russian Federation); Orlikovskiy, N. A. [Russian Academy of Sciences, Physical Technological Institute (Russian Federation); Ivanova, E. S. [Moscow State University (Russian Federation)

2012-06-15T23:59:59.000Z

33

Measurement of Semiconductor Surface Potential using the Scanning Electron Microscope  

SciTech Connect

We calibrate the secondary electron signal from a standard scanning electron microscope to voltage, yielding an image of the surface or near-surface potential. Data on both atomically abrupt heterojunction GaInP/GaAs and diffused homojunction Si solar cell devices clearly show the expected variation in potential with position and applied bias, giving depletion widths and locating metallurgical junctions to an accuracy better than 10 nm. In some images, distortion near the p-n junction is observed, seemingly consistent with the effects of lateral electric fields (patch fields). Reducing the tube bias removes this distortion. This approach results in rapid and straightforward collection of near-surface potential data using a standard scanning electron microscope.

Heath, J. T.; Jiang, C. S.; Al-Jassim, M. M.

2012-02-15T23:59:59.000Z

34

Foucault imaging by using non-dedicated transmission electron microscope  

Science Conference Proceedings (OSTI)

An electron optical system for observing Foucault images was constructed using a conventional transmission electron microscope without any special equipment for Lorentz microscopy. The objective lens was switched off and an electron beam was converged by a condenser optical system to the crossover on the selected area aperture plane. The selected area aperture was used as an objective aperture to select the deflected beam for Foucault mode, and the successive image-forming lenses were controlled for observation of the specimen images. The irradiation area on the specimen was controlled by selecting the appropriate diameter of the condenser aperture.

Taniguchi, Yoshifumi [Science and Medical Systems Business Group, Hitachi High-Technologies Corp., Ichige, Hitachinaka, Ibaraki 312-8504 (Japan); Matsumoto, Hiroaki [Corporate Manufacturing Strategy Group, Hitachi High-Technologies Corp., Ishikawa-cho, Hitachinaka, Ibaraki 312-1991 (Japan); Harada, Ken [Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-0395 (Japan)

2012-08-27T23:59:59.000Z

35

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

AEM AEM AEME The Analytical Electron Microscope is optimized for elemental microanalysis. The basic instrument is a JEOL 200CX microscope with a side-entry double-tilt goniometer stage and an assortment of specimen holders. This machine can be operated at between 80 and 200 kV in the TEM or STEM mode. Electron energy loss and x-ray signals for elemental microanalysis or spectral imaging can be collected either separately or simultaneously using probe diameters from 6nm to 100nm. Diffraction modes include convergent beam diffraction for three-dimensional structure information and micro-diffraction with a minimum probe size of 20nm. For updates or details, contact Zonghoon Lee or Velimir Radmilovic. The instrument is equipped with two Kevex EDXS detectors and a Gatan PEELS

36

Pulsed Power for a Dynamic Transmission Electron Microscope  

Science Conference Proceedings (OSTI)

Lawrence Livermore National Laboratory (LLNL) has converted a commercial 200kV transmission electron microscope (TEM) into an ultrafast, nanoscale diagnostic tool for material science studies. The resulting Dynamic Transmission Electron Microscope (DTEM) has provided a unique tool for the study of material phase transitions, reaction front analyses, and other studies in the fields of chemistry, materials science, and biology. The TEM's thermionic electron emission source was replaced with a fast photocathode and a laser beam path was provided for ultraviolet surface illumination. The resulting photoelectron beam gives downstream images of 2 and 20 ns exposure times at 100 and 10 nm spatial resolution. A separate laser, used as a pump pulse, is used to heat, ignite, or shock samples while the photocathode electron pulses, carefully time-synchronized with the pump, function as probe in fast transient studies. The device functions in both imaging and diffraction modes. A laser upgrade is underway to make arbitrary cathode pulse trains of variable pulse width of 10-1000 ns. Along with a fast e-beam deflection scheme, a 'movie mode' capability will be added to this unique diagnostic tool. This talk will review conventional electron microscopy and its limitations, discuss the development and capabilities of DTEM, in particularly addressing the prime and pulsed power considerations in the design and fabrication of the DTEM, and conclude with the presentation of a deflector and solid-state pulser design for Movie-Mode DTEM.

dehope, w j; browning, n; campbell, g; cook, e; king, w; lagrange, t; reed, b; stuart, b; Shuttlesworth, R; Pyke, B

2009-06-25T23:59:59.000Z

37

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

LIBRA LIBRA The 200kV Zeiss monochromated LIBRA 200MC is designed to produce high contrast imaging for TEM and STEM and either convergent beam or parallel beam diffraction using Koehler illumination.In addition, the incorporation of a monochromator into the field emission gun enables energy resolution of ~0.15eV for electron energy loss spectroscopy. The dedicated in-column Omega Filter implemented in this microscope also can be used for both spectroscopic analysis and energy-filtered imaging with a 2048x2048 CCD camera. The high tilt capability of the stage and pole piece accepts various types of analytical holders.This microscope is optimized for soft materials applications that require either the high contrast imaging performance or analytical methods such as EF-TEM and STEM.( Instrument

38

Photocathode Optimization for a Dynamic Transmission Electron Microscope: Final Report  

SciTech Connect

The Dynamic Transmission Electron Microscope (DTEM) team at Harvey Mudd College has been sponsored by LLNL to design and build a test setup for optimizing the performance of the DTEM's electron source. Unlike a traditional TEM, the DTEM achieves much faster exposure times by using photoemission from a photocathode to produce electrons for imaging. The DTEM team's work is motivated by the need to improve the coherence and current density of the electron cloud produced by the electron gun in order to increase the image resolution and contrast achievable by DTEM. The photoemission test setup is nearly complete and the team will soon complete baseline tests of electron gun performance. The photoemission laser and high voltage power supply have been repaired; the optics path for relaying the laser to the photocathode has been finalized, assembled, and aligned; the internal setup of the vacuum chamber has been finalized and mostly implemented; and system control, synchronization, and data acquisition has been implemented in LabVIEW. Immediate future work includes determining a consistent alignment procedure to place the laser waist on the photocathode, and taking baseline performance measurements of the tantalum photocathode. Future research will examine the performance of the electron gun as a function of the photoemission laser profile, the photocathode material, and the geometry and voltages of the accelerating and focusing components in the electron gun. This report presents the team's progress and outlines the work that remains.

Ellis, P; Flom, Z; Heinselman, K; Nguyen, T; Tung, S; Haskell, R; Reed, B W; LaGrange, T

2011-08-04T23:59:59.000Z

39

In situ laser processing in a scanning electron microscope  

Science Conference Proceedings (OSTI)

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {micro}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas [University of Tennessee, Knoxville (UTK); Fowlkes, Jason Davidson [ORNL; Rack, Prof. Philip [University of Tennessee, Knoxville (UTK); Moore, Tom [OmniProbe, Inc.; Magel, Greg [OmniProbe, Inc.; Hartfield, Cheryl [OmniProbe, Inc.

2012-01-01T23:59:59.000Z

40

In situ laser processing in a scanning electron microscope  

SciTech Connect

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {mu}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas A.; Magel, Gregory A.; Hartfield, Cheryl D.; Moore, Thomas M.; Fowlkes, Jason D.; Rack, Philip D. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

2012-07-15T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


41

Miniature self-contained vacuum compatible electronic imaging microscope  

DOE Patents (OSTI)

A vacuum compatible CCD-based microscopic camera with an integrated illuminator. The camera can provide video or still feed from the microscope contained within a vacuum chamber. Activation of an optional integral illuminator can provide light to illuminate the microscope subject. The microscope camera comprises a housing with a objective port, modified objective, beam-splitter, CCD camera, and LED illuminator.

Naulleau, Patrick P. (Oakland, CA); Batson, Phillip J. (Alameda, CA); Denham, Paul E. (Crockett, CA); Jones, Michael S. (San Francisco, CA)

2001-01-01T23:59:59.000Z

42

Atomic Resolution Imaging with a sub-50 pm Electron Probe  

SciTech Connect

Using a highly coherent focused electron probe in a 5th order aberration-corrected transmission electron microscope, we report on resolving a crystal spacing less than 50 pm. Based on the geometrical source size and residual coherent and incoherent axial lens aberrations, an electron probe is calculated, which is theoretically capable of resolving an ideal 47 pm spacing with 29percent contrast. Our experimental data show the 47 pm spacing of a Ge 114 crystal imaged with 11-18percent contrast at a 60-95percent confidence level, providing the first direct evidence for sub 50-pm resolution in ADF STEM imaging.

Erni, Rolf P.; Rossell, Marta D.; Kisielowski, Christian; Dahmen, Ulrich

2009-03-02T23:59:59.000Z

43

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

Specimen Preparation Specimen Preparation Preparation of samples with large transparent areas and flat surfaces is a key element of electron microscopy. In particular, the interpretation of lattice or holographic images is often limited by the sample's geometry and surface roughness. These parameters are largely determined by a particular sample preparation procedure. The increasing demand for microscopes with a spatial resolution of better than 1Ã… increases the need for improved sample preparation techniques. A substantial effort at NCEM is devoted to the development of reliable and specialized thinning techniques. Current programs explore the application of chemicals to shape the surfaces of thin films, the use of nanospheres for observation of small particles, and the

44

Transmission electron microscope sample holder with optical features  

DOE Patents (OSTI)

A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.

Milas, Mirko (Port Jefferson, NY); Zhu, Yimei (Stony Brook, NY); Rameau, Jonathan David (Coram, NY)

2012-03-27T23:59:59.000Z

45

Examining the structure and bonding in complex oxides using aberration-corrected imaging and spectroscopy  

SciTech Connect

Our ability to directly characterize the atomic and electronic structures is crucial to developing a fundamental understanding of structure-property relationships in complex-oxide materials. Here, we examine one specific example, the misfit-layered thermoelectric material Ca3Co4O9, which exhibits a high Seebeck coefficient governed by spin-entropy transport as well as hopping-mediated electron transport. However, the role of oxygen and its bonding with cobalt in thermoelectric transport remains unclear. We use atomic-resolution annular bright-field imaging to directly image the oxygen sublattice and to combine our experimental data with multislice image calculations to find that the oxygen atoms in the CoO2 subsystem are highly ordered, while the oxygen-atomic columns are displaced in the Ca2CoO3 subsystem. Atomic-column-resolved electron energy-loss spectroscopy and spectrum image calculations are used to quantify the bonding in the different subsystems of incommensurate Ca3Co4O9. We find that the holes in the CoO2 subsystem are delocalized, which could be responsible for the p-type conductivity found in the CoO2 subsystem.

Klie, Robert F [University of Illinois, Chicago; Qiao, Q [University of Illinois at Chicago, Chicago, Illinois 60607, USA; Paulauskas, T [University of Illinois at Chicago, Chicago, Illinois 60607, USA; Ramassee, Q [SuperSTEM, Daresbury, United Kingdom; Oxley, Mark P [ORNL; Idrobo Tapia, Juan C [ORNL

2012-01-01T23:59:59.000Z

46

A versatile three-contact electrical biasing transmission electron microscope specimen holder for electron holography and electron tomography of working devices  

E-Print Network (OSTI)

A versatile three-contact electrical biasing transmission electron microscope specimen holder to characterize nanoscale materials and devices under operating conditions in the transmission electron microscope in the transmission electron microscope (TEM) at a spatial resolution that can approach the nanometer scale

Dunin-Borkowski, Rafal E.

47

NCEM National Center for Electron Microscopy: Microscope Driving...  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscope Driving Tests 3010 test.pdf CM 200 test.pdf CM 300 test.pdf Libra test.pdf FIB test.pdf Tecnai test.pdf TEAM 0.5 test.pdf TEAM I test.pdf...

48

Telecontrol of Ultra-High Voltage Electron Microscope over Global IPv6 Network  

Science Conference Proceedings (OSTI)

Osaka University has an Ultra-High VoltageElectron Microscope (UHVEM) which can provide highquality specimen images for worldwide researchers. Forusability improvements, we have worked on thetelecontrol of the UHVEM. In this paper, we would liketo introduce ...

Toyokazu Akiyama; Shinji Shimojo; Shojiro Nishio; Yoshinori Kitatsuji; Steven Peltier; Thomas Hutton; Fang-Pang Lin

2003-01-01T23:59:59.000Z

49

Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips  

Science Conference Proceedings (OSTI)

A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM.

Eisenstein, Alon; Goh, M. Cynthia [Department of Chemistry and Institute for Optical Sciences, University of Toronto, 80 St. George Street, Toronto M5S 3H6 (Canada)

2012-03-15T23:59:59.000Z

50

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

CM 200 FEG CM 200 FEG AEME The Philips CM200/FEG is a versatile instrument that is designed for analysis of the physical, chemical and magnetic microstructure at high spatial resolution. In addition to high resolution imaging capability, the machine is optimized for analytical electron microscopy and Lorentz imaging, under normal as well as dynamic conditions of variable temperature (77K - 1250K) and applied magnetic fields. Spatially resolved compositional analysis by X-ray emission spectroscopy (Z > 5), local electronic structure measurements by electron energy-loss spectroscopy (Z > 2), convergent beam electron diffraction for three-dimensional structure information, and energy-filtered imaging at the nanometer scale are some of the techniques available on this instrument. In addition, a TEM differential phase

51

NCEM National Center for Electron Microscopy: Microscopes and...  

NLE Websites -- All DOE Office Websites (Extended Search)

TEM and STEM. In addition, the incorporation of a monochromator into the gun permits electron energy loss spectroscopy to be performed with an energy resolution of 0.15eV. This...

52

NCEM National Center for Electron Microscopy: Microscopes and...  

NLE Websites -- All DOE Office Websites (Extended Search)

The system contains both a focused Ga+ ion beam and a field emission scanning electron column. The ion column can be used for selective removal of material by ion beam...

53

CFN | Hitachi HD2700C Scanning Transmission Electron Microscope  

NLE Websites -- All DOE Office Websites (Extended Search)

compositional and electronic information. Here is an example of EELS-2D mapping on Li-battery electrode materials as how Li and Fe elements distributed at nanometer scale. SEM...

54

Thin-film thickness measurement using x-ray peak ratioing in the scanning electron microscope  

Science Conference Proceedings (OSTI)

The procedure used to measure laser target film thickness using a scanning electron microscope is summarized. This method is generally applicable to any coating on any substrate as long as the electron energy is sufficient to penetrate the coating and the substrate produces an x-ray signal which can pass back through the coating and be detected. (MOW)

Elliott, N.E.; Anderson, W.E.; Archuleta, T.A.; Stupin, D.M.

1981-01-01T23:59:59.000Z

55

Quantitative Nanostructure Characterization Using Atomic Pair Distribution Functions Obtained From Laboratory Electron Microscopes  

Science Conference Proceedings (OSTI)

Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.

Abeykoon M.; Billinge S.; Malliakas, C.D.; Juhas, P.; Bozin, E.S.; Kanatzidis, M.G.

2012-05-01T23:59:59.000Z

56

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

SPLEEM SPLEEM Publications Imaging Spin Reorientation Transitions in Consecutive Atomic Co layers, Farid El Gabaly, Silvia Gallego, M. Carmen Munoz, Laszlo Szunyogh, Peter Weinberger, Kevin F. McCarty, Christof Klein, Andreas K. Schmid, Juan de la Figuera, submitted Direct imaging of spin-reorientation transitions in ultra-thin Ni films by spin-polarized low-energy electron microscopy, C. Klein, A. K. Schmid, R. Ramchal, and M. Farle, submitted Controlling the kinetic order of spin-reorientation transitions in Ni/Cu(100) films by tuning the substrate step-structure, C. Klein, R. Ramchal, A.K. Schmid, M. Farle, submitted Self-organization and magnetic domain microstructure of Fe nanowire arrays, N. Rougemaille and A.K. Schmid, submitted Self-Assembled Nanofold Network Formation on Layered Crystal Surfaces

57

Ion and electron beam nanofabrication of the which-way double-slit experiment in a transmission electron microscope  

Science Conference Proceedings (OSTI)

We have realized a which-way experiment closely resembling the original Feynman's proposal exploiting focused ion beam milling to prepare two nanoslits and electron beam induced deposition to grow, selectively over one of them, electron transparent layers of low atomic number amorphous material to realize a which-way detector for high energy electrons. By carrying out the experiment in an electron microscope equipped with an energy filter, we show that the inelastic scattering of electron transmitted through amorphous layers of different thicknesses provides the control of the dissipative interaction process responsible for the localization phenomena which cancels out the interference effects.

Frabboni, Stefano [Department of Physics, University of Modena and Reggio Emilia and CNR-Institute of Nanoscience-S3, via G. Campi 213/a, 41100 Modena (Italy); Gazzadi, Gian Carlo [CNR-Institute of Nanoscience-S3, via G. Campi 213/a, 41100 Modena (Italy); Pozzi, Giulio [Department of Physics, University of Bologna, viale B. Pichat 6/2, 40127 Bologna (Italy)

2010-12-27T23:59:59.000Z

58

microscopes_2001  

NLE Websites -- All DOE Office Websites (Extended Search)

5 . His work was a giant 6 6 6 6 6 for science. Today, microscopes are much stronger. An electron microscope can make tiny organisms look 200,000 times 7 7 7 7 7 size. A few...

59

Spectroscopic imaging in electron microscopy  

Science Conference Proceedings (OSTI)

In the scanning transmission electron microscope, multiple signals can be simultaneously collected, including the transmitted and scattered electron signals (bright field and annular dark field or Z-contrast images), along with spectroscopic signals such as inelastically scattered electrons and emitted photons. In the last few years, the successful development of aberration correctors for the electron microscope has transformed the field of electron microscopy, opening up new possibilities for correlating structure to functionality. Aberration correction not only allows for enhanced structural resolution with incident probes into the sub-angstrom range, but can also provide greater probe currents to facilitate mapping of intrinsically weak spectroscopic signals at the nanoscale or even the atomic level. In this issue of MRS Bulletin, we illustrate the power of the new generation of electron microscopes with a combination of imaging and spectroscopy. We show the mapping of elemental distributions at atomic resolution and also the mapping of electronic and optical properties at unprecedented spatial resolution, with applications ranging from graphene to plasmonic nanostructures, and oxide interfaces to biology.

Pennycook, Stephen J [ORNL; Colliex, C. [Universite Paris Sud, Orsay, France

2012-01-01T23:59:59.000Z

60

A Remote Operation System for the 3MV Electron Microscope with a Both-Direction Conversation Capability  

Science Conference Proceedings (OSTI)

The 3MV ultrahigh voltage electron microscope (UHVEM) at the Research Center for UHVEM, Osaka University, has been widely used for microscopy of thick specimens, taking advantage of high penetration power of incident electrons. Recent developments in ...

Hirotaro Mori; Kiyokazu Yoshida; Shinji Shimojo; Hiroki Nogawa; Toyokazu Akiyama; Heishichiro Takahashi; Tamaki Shibayama

2004-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


61

Aberration-Coreected Electron Microscopy at Brookhaven National Laboratory  

Science Conference Proceedings (OSTI)

The last decade witnessed the rapid development and implementation of aberration correction in electron optics, realizing a more-than-70-year-old dream of aberration-free electron microscopy with a spatial resolution below one angstrom [1-9]. With sophisticated aberration correctors, modern electron microscopes now can reveal local structural information unavailable with neutrons and x-rays, such as the local arrangement of atoms, order/disorder, electronic inhomogeneity, bonding states, spin configuration, quantum confinement, and symmetry breaking [10-17]. Aberration correction through multipole-based correctors, as well as the associated improved stability in accelerating voltage, lens supplies, and goniometers in electron microscopes now enables medium-voltage (200-300kV) microscopes to achieve image resolution at or below 0.1nm. Aberration correction not only improves the instrument's spatial resolution but, equally importantly, allows larger objective lens pole-piece gaps to be employed thus realizing the potential of the instrument as a nanoscale property-measurement tool. That is, while retaining high spatial resolution, we can use various sample stages to observe the materials response under various temperature, electric- and magnetic- fields, and atmospheric environments. Such capabilities afford tremendous opportunities to tackle challenging science and technology issues in physics, chemistry, materials science, and biology. The research goal of the electron microscopy group at the Dept. of Condensed Matter Physics and Materials Science and the Center for Functional Nanomaterials, as well as the Institute for Advanced Electron Microscopy, Brookhaven National Laboratory (BNL), is to elucidate the microscopic origin of the physical- and chemical-behavior of materials, and the role of individual, or groups of atoms, especially in their native functional environments. We plan to accomplish this by developing and implementing various quantitative electron microscopy techniques in strongly correlated electron systems and nanostructured materials. As a first step, with the support of Materials Science Division, Office of Basic Energy Science, US Department of Energy, and the New York State Office of Science, Technology, and Academic Research, recently we acquired three aberration-corrected electron microscopes from the three major microscope manufacturers, i.e., JEOL, Hitachi, and FEI. The Hitachi HD2700C is equipped with a probe corrector, the FEI Titan 80-300 has an imaging corrector, while the JEOL2200MCO has both. All the correctors are of the dual-hexapole type, designed and manufactured by CEOS GmbH based on the design due to Rose and Haider [3, 18]. All these three are one-of-a-kind in the US, designed for specialized capabilities in characterizing nanoscale structure. In this chapter, we review the performance of these state-of-the art instruments and the new challenges associated with the improved spatial resolution, including the environment requirements of the laboratory that hosts these instruments. Although each instrument we describe here has its own strengths and drawbacks, it is not our intention to rank them in terms of their performance, especially their spatial resolution in imaging.

Zhu,Y.; Wall, J.

2008-04-01T23:59:59.000Z

62

Analysis with electron microscope of multielement samples using pure element standards  

DOE Patents (OSTI)

A method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons, simultaneously measuring the electron dosage and x-ray intensities for each sample of element to determine a "K.sub.AB " value to be used in the equation ##EQU1## where I is intensity and C is concentration for elements A and B, and exposing the multielement sample to determine the concentrations of the elements in the sample.

King, Wayne E. (Western Springs, IL)

1987-01-01T23:59:59.000Z

63

Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope  

DOE Patents (OSTI)

A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.

de Jonge, Niels (Oak Ridge, TN)

2010-08-17T23:59:59.000Z

64

The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory  

Science Conference Proceedings (OSTI)

Few universities or colleges have an accelerator for use with advanced physics laboratories, but many of these institutions have a scanning electron microscope (SEM) on site, often in the biology department. As an accelerator for the undergraduate, advanced physics laboratory, the SEM is an excellent substitute for an ion accelerator. Although there are no nuclear physics experiments that can be performed with a typical 30 kV SEM, there is an opportunity for experimental work on accelerator physics, atomic physics, electron-solid interactions, and the basics of modern e-beam lithography.

Peterson, Randolph S. [Department of Physics and Astronomy, University of the South, 735 University Avenue, Sewanee TN 37383 (United States); Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 50 Vassar Street, Cambridge MA 01239 (United States); Berggren, Karl K.; Mondol, Mark [Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 50 Vassar Street, Cambridge MA 01239 (United States)

2011-06-01T23:59:59.000Z

65

Characterization of electron microscopes with binary pseudo-random multilayer test samples  

SciTech Connect

Verification of the reliability of metrology data from high quality x-ray optics requires that adequate methods for test and calibration of the instruments be developed. For such verification for optical surface profilometers in the spatial frequency domain, a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) gratings and arrays has been suggested [Proc. SPIE 7077-7 (2007), Opt. Eng. 47(7), 073602-1-5 (2008)} and proven to be an effective calibration method for a number of interferometric microscopes, a phase shifting Fizeau interferometer, and a scatterometer [Nucl. Instr. and Meth. A 616, 172-82 (2010)]. Here we describe the details of development of binary pseudo-random multilayer (BPRML) test samples suitable for characterization of scanning (SEM) and transmission (TEM) electron microscopes. We discuss the results of TEM measurements with the BPRML test samples fabricated from a WiSi2/Si multilayer coating with pseudo randomly distributed layers. In particular, we demonstrate that significant information about the metrological reliability of the TEM measurements can be extracted even when the fundamental frequency of the BPRML sample is smaller than the Nyquist frequency of the measurements. The measurements demonstrate a number of problems related to the interpretation of the SEM and TEM data. Note that similar BPRML test samples can be used to characterize x-ray microscopes. Corresponding work with x-ray microscopes is in progress.

Yashchuk, Valeriy V; Conley, Raymond; Anderson, Erik H; Barber, Samuel K; Bouet, Nathalie; McKinney, Wayne R; Takacs, Peter Z; Voronov, Dmitriy L

2010-09-17T23:59:59.000Z

66

Probing the electronic structure and optical response of a graphene quantum disk supported on monolayer graphene  

SciTech Connect

In this paper, we show that a graphene quantum disk (GQD) can be generated on monolayer graphene via structural modification using the electron beam. The electronic structure and local optical responses of the GQD, supported on monolayer graphene, were probed with electron energy-loss spectrum imaging on an aberration-corrected scanning transmission electron microscope. We observe that for small GQD, {approx}1.3 nm in diameter, the electronic structure and optical response are governed by the dominating edge states, and are distinctly different from either monolayer graphene or double-layer graphene. Highly localized plasmon modes are generated at the GQD due to the confinement from the edge of the GQD in all directions. The highly localized optical response from GQDs could find use in designing nanoscale optoelectronic and plasmonic devices based on monolayer graphene.

Zhou, Wu [Vanderbilt University; Pennycook, Stephen J [ORNL; Idrobo Tapia, Juan C [ORNL

2012-01-01T23:59:59.000Z

67

Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy  

Science Conference Proceedings (OSTI)

Observation of growth, synthesis, dynamics and electrochemical reactions in the liquid state is an important yet largely unstudied aspect of nanotechnology. The only techniques that can potentially provide the insights necessary to advance our understanding of these mechanisms is simultaneous atomic-scale imaging and quantitative chemical analysis (through spectroscopy) under environmental conditions in the transmission electron microscope (TEM). In this study we describe the experimental and technical conditions necessary to obtain electron energy loss (EEL) spectra from a nanoparticle in colloidal suspension using aberration corrected scanning transmission electron microscopy (STEM) combined with the environmental liquid stage. At a fluid path length below 400 nm, atomic resolution images can be obtained and simultaneous compositional analysis can be achieved. We show that EEL spectroscopy can be used to quantify the total fluid path length around the nanoparticle, and demonstrate characteristic core-loss signals from the suspended nanoparticles can be resolved and analyzed to provide information on the local interfacial chemistry with the surrounding environment. The combined approach using aberration corrected STEM and EEL spectra with the in situ fluid stage demonstrates a plenary platform for detailed investigations of solution based catalysis and biological research.

Jungjohann, K. L.; Evans, James E.; Aguiar, Jeff; Arslan, Ilke; Browning, Nigel D.

2012-06-04T23:59:59.000Z

68

Analysis with electron microscope of multielement samples using pure element standards  

DOE Patents (OSTI)

This disclosure describes a method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons. Simultaneously the electron dosage and x-ray intensities are measured for each sample of element to determine a ''K/sub AB/'' value to be used in the equation (I/sub A/I/sub B/) = K/sub AB/ (C/sub A//C/sub B/), where I is intensity and C is concentration for elements A and B. The multielement sample is exposed to determine the concentrations of the elements in the sample.

King, W.E.

1986-01-06T23:59:59.000Z

69

In situ nanomechanical testing in focused ion beam and scanning electron microscopes  

Science Conference Proceedings (OSTI)

The recent interest in size-dependent deformation of micro- and nanoscale materials has paralleled both technological miniaturization and advancements in imaging and small-scale mechanical testing methods. Here we describe a quantitative in situ nanomechanical testing approach adapted to a dual-beam focused ion beam and scanning electron microscope. A transducer based on a three-plate capacitor system is used for high-fidelity force and displacement measurements. Specimen manipulation, transfer, and alignment are performed using a manipulator, independently controlled positioners, and the focused ion beam. Gripping of specimens is achieved using electron-beam assisted Pt-organic deposition. Local strain measurements are obtained using digital image correlation of electron images taken during testing. Examples showing results for tensile testing of single-crystalline metallic nanowires and compression of nanoporous Au pillars will be presented in the context of size effects on mechanical behavior and highlight some of the challenges of conducting nanomechanical testing in vacuum environments.

Gianola, D. S. [Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104 (United States); Institute for Applied Materials, Karlsruhe Institute of Technology, Karlsruhe (Germany); Sedlmayr, A.; Moenig, R.; Kraft, O. [Institute for Applied Materials, Karlsruhe Institute of Technology, Karlsruhe (Germany); Volkert, C. A. [Institute for Materials Physics, Georg-August University of Goettingen, Goettingen (Germany); Major, R. C.; Cyrankowski, E.; Asif, S. A. S.; Warren, O. L. [Hysitron, Inc., Minneapolis, Minnesota 55344 (United States)

2011-06-15T23:59:59.000Z

70

Magnetic lens apparatus for a low-voltage high-resolution electron microscope  

DOE Patents (OSTI)

A lens apparatus in which a beam of charged particles of low accelerating voltage is brought to a focus by a magnetic field, the lens being situated behind the target position. The lens comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. The lens apparatus comprises the sole focusing lens for high-resolution imaging in a low-voltage scanning electron microscope.

Crewe, Albert V. (Palos Park, IL)

1996-01-01T23:59:59.000Z

71

Looking At and Into the Ultra-Small  

Science Conference Proceedings (OSTI)

... aberration-corrected TEM, the electrons from which ... as atom probe and transmission electron microscopy. The helium ion microscope provides a ...

2012-06-08T23:59:59.000Z

72

A Scanning Electron Microscope Facility for Characterization of Tritium Containing Materials  

SciTech Connect

A scanning electron microscope (SEM) facility for the examination of tritium-containing materials is operational at Mound Laboratory. The SEM is installed with the sample chamber incorporated as an integral part of an inert gas glovebox facility to enable easy handling of radioactive and pyrophoric materials. A standard SEM (ERTEC Model B-1) was modified to meet dimensional, operational, and safety-related requirements. A glovebox was designed and fabricated which permitted access with the gloves to all parts of the SEM sample chamber to facilitate detector and accessory replacement and repairs. A separate console combining the electron optical column and specimen chamber was interfaced to the glovebox by a custom-made, neoprene bellows so that the vibrations normally associated with the blowers and pumps were damped. Photomicrographs of tritiated pyrophoric materials show the usefulness of this facility. Some of the difficulties involved in the investigation of these materials are also discussed.

Downs, G. L.; Tucker, P. A.

1975-10-01T23:59:59.000Z

73

Graphical template software for accurate micromanipulation in a scanning electron microscope  

SciTech Connect

Micromanipulation techniques in a scanning electron microscope (SEM) have been utilized for assembling micrometer-sized structures. The precision of the assembled microstructures has been limited by the poor accuracy of the SEM image. We have developed a software to assist the operator in the accurate assembly of microstructures in a SEM, in which computer-generated outlines of the target structure [graphical templates (GTs)] are superimposed on the monitor. The displayed GTs are distorted on the basis of the image properties of the SEM evaluated in advance. As a consequence, the operator can construct microstructures with a high precision only by maneuvering the manipulator so that the outline of each object perfectly overlaps the GT without any alteration of the electron optics or circuits for improving the image accuracy.

Kasaya, Takeshi [Nanotechnology Innovation Center, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan); Miyazaki, Hideki T. [Quantum Dot Research Center, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)

2009-01-15T23:59:59.000Z

74

Correction of distance-dependent blurring in projection data for fully three-dimensional electron microscopic reconstruction  

Science Conference Proceedings (OSTI)

We propose a method of correction for distance-dependent blurring, which is one of the limiting factors to achieving higher resolution in 3D reconstructions of biological specimens from 2D projections obtained by an electron microscope. Our proposed ... Keywords: contrast transfer function, distance-dependent blurring, electron microscopy, stationary phase

Joanna Klukowska; Gabor T. Herman; Ivan G. Kazantsev

2010-04-01T23:59:59.000Z

75

Solving the Accelerator-Condenser Coupling Problem in a Nanosecond Dynamic Transmission Electron Microscope  

Science Conference Proceedings (OSTI)

We describe a modification to a transmission electron microscope (TEM) that allows it to briefly (using a pulsed-laser-driven photocathode) operate at currents in excess of 10 mA while keeping the effects of condenser lens aberrations to a minimum. This modification allows real-space imaging of material microstructure with a resolution of order 10 nm over regions several {micro}m across with an exposure time of 15 ns. This is more than 6 orders of magnitude faster than typical video-rate TEM imaging. The key is the addition of a weak magnetic lens to couple the large-diameter high-current beam exiting the accelerator into the acceptance aperture of a conventional TEM condenser lens system. We show that the performance of the system is essentially consistent with models derived from ray tracing and finite element simulations. The instrument can also be operated as a conventional TEM by using the electron gun in a thermionic mode. The modification enables very high electron current densities in {micro}m-sized areas and could also be used in a non-pulsed system for high-throughput imaging and analytical TEM.

Reed, B W; LaGrange, T; Shuttlesworth, R M; Gibson, D J; Campbell, G H; Browning, N D

2009-12-29T23:59:59.000Z

76

The TEAM Project  

NLE Websites -- All DOE Office Websites (Extended Search)

on TV The TEAM Project (Transmission Electron Aberration-Corrected Microscope) Recent Publications from TEAM Why What Who How When and Where DOE In December 1959, physicist Richard...

77

Untitled Document  

NLE Websites -- All DOE Office Websites (Extended Search)

is still out of reach. The TEAM project is a collaborative effort to redesign the electron microscope around aberration-corrected optics in order to extend the spatial...

78

Novel Microscopy Techniques  

Science Conference Proceedings (OSTI)

Oct 19, 2011 ... Atomic Imaging of Surface and Bulk with an Aberration Corrected Scanning Electron Microscope: Yimei Zhu1; 1Brookhaven National ...

79

Microscopic linear liquid streams in vacuum: Injection of solvated biological samples into X-ray free electron lasers  

SciTech Connect

Microscopic linear liquid free-streams offer a means of gently delivering biological samples into a probe beam in vacuum while maintaining the sample species in a fully solvated state. By employing gas dynamic forces to form the microscopic liquid stream (as opposed to a conventional solid-walled convergent nozzle), liquid free-streams down to 300 nm diameter have been generated. Such 'Gas Dynamic Virtual Nozzles' (GDVN) are ideally suited to injecting complex biological species into an X-ray Free Electron Laser (XFEL) to determine the structure of the biological species via Serial Femtosecond Crystallography (SFX). GDVN injector technology developed for this purpose is described.

Doak, R. B.; DePonte, D. P.; Nelson, G.; Camacho-Alanis, F.; Ros, A.; Spence, J. C. H.; Weierstall, U. [Arizona State University, Tempe, AZ 85287-1504 (United States); Centre for Free-Electron Laser Science, DESY, D-22607 Hamburg (Germany); Arizona State University, Tempe, AZ 85287-1504 (United States)

2012-11-27T23:59:59.000Z

80

A microscopic model of electronic field noise heating in ion traps  

E-Print Network (OSTI)

Motional heating of ions in micro-fabricated traps is a challenge hindering experimental realization of large-scale quantum processing devices. Recently a series of measurements of the heating rates in surface-electrode ion traps characterized their frequency, distance, and temperature dependencies, but our understanding of the microscopic origin of this noise is still vague. In this work we develop a theoretical model for the electric field noise which is associated with a random distribution of adsorbed atoms on the trap electrode surface. By using first principle calculations of the fluctuating dipole moments of the adsorbed atoms we evaluate the distance, frequency and temperature dependence of the resulting electric field fluctuation spectrum.Our theory calculates the noise spectrum beyond the standard scenario of two-level fluctuators, by incorporating all the relevant vibrational states. The $1/f$ noise is shown to commence at roughly the frequency of the fundamental phonon transition rate and the $d^{...

Safavi-Naini, A; Weck, P; Sadeghpour, H R

2011-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


81

A microscopic model of electronic field noise heating in ion traps  

E-Print Network (OSTI)

Motional heating of ions in micro-fabricated traps is a challenge hindering experimental realization of large-scale quantum processing devices. Recently a series of measurements of the heating rates in surface-electrode ion traps characterized their frequency, distance, and temperature dependencies, but our understanding of the microscopic origin of this noise is still vague. In this work we develop a theoretical model for the electric field noise which is associated with a random distribution of adsorbed atoms on the trap electrode surface. By using first principle calculations of the fluctuating dipole moments of the adsorbed atoms we evaluate the distance, frequency and temperature dependence of the resulting electric field fluctuation spectrum.Our theory calculates the noise spectrum beyond the standard scenario of two-level fluctuators, by incorporating all the relevant vibrational states. The $1/f$ noise is shown to commence at roughly the frequency of the fundamental phonon transition rate and the $d^{-4}$ dependence with distance of the ion from the electrode surface is established.

A. Safavi-Naini; P. Rabl; P. Weck; H. R. Sadeghpour

2011-06-10T23:59:59.000Z

82

Magnetic lens apparatus for use in high-resolution scanning electron microscopes and lithographic processes  

DOE Patents (OSTI)

Disclosed are lens apparatus in which a beam of charged particlesis brought to a focus by means of a magnetic field, the lens being situated behind the target position. In illustrative embodiments, a lens apparatus is employed in a scanning electron microscopeas the sole lens for high-resolution focusing of an electron beam, and in particular, an electron beam having an accelerating voltage of from about 10 to about 30,000 V. In one embodiment, the lens apparatus comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. In other embodiments, the lens apparatus comprises a magnetic dipole or virtual magnetic monopole fabricated from a variety of materials, including permanent magnets, superconducting coils, and magnetizable spheres and needles contained within an energy-conducting coil. Multiple-array lens apparatus are also disclosed for simultaneous and/or consecutive imaging of multiple images on single or multiple specimens. The invention further provides apparatus, methods, and devices useful in focusing charged particle beams for lithographic processes.

Crewe, Albert V. (Dune Acres, IN)

2000-01-01T23:59:59.000Z

83

Scanning electron microscopic analyses of Ferrocyanide tank wastes for the Ferrocyanide safety program  

Science Conference Proceedings (OSTI)

This is Fiscal Year 1995 Annual Report on the progress of activities relating to the application of scanning electron microscopy in addressing the Ferrocyanide Safety Issue associated with Hanford Site high-level radioactive waste tanks. The status of the FY 1995 activities directed towards establishing facilities capable of providing SEM based micro-characterization of ferrocyanide tank wastes is described. A summary of key events in the SEM task over FY 1995 and target activities in FY 1996 are presented. A brief overview of the potential applications of computer controlled SEM analytical data in light of analyses of ferrocyanide simulants performed by an independent contractor is also presented

Callaway, W.S.

1995-09-01T23:59:59.000Z

84

Big microscope  

NLE Websites -- All DOE Office Websites (Extended Search)

microscope Name: stacy Status: NA Age: NA Location: NA Country: NA Date: Around 1993 Question: What type of Microscope has the highest magnification? Replies: What type of...

85

Real-time studies of battery electrochemical reactions inside a transmission electron microscope.  

DOE Green Energy (OSTI)

We report the development of new experimental capabilities and ab initio modeling for real-time studies of Li-ion battery electrochemical reactions. We developed three capabilities for in-situ transmission electron microscopy (TEM) studies: a capability that uses a nanomanipulator inside the TEM to assemble electrochemical cells with ionic liquid or solid state electrolytes, a capability that uses on-chip assembly of battery components on to TEM-compatible multi-electrode arrays, and a capability that uses a TEM-compatible sealed electrochemical cell that we developed for performing in-situ TEM using volatile battery electrolytes. These capabilities were used to understand lithiation mechanisms in nanoscale battery materials, including SnO{sub 2}, Si, Ge, Al, ZnO, and MnO{sub 2}. The modeling approaches used ab initio molecular dynamics to understand early stages of ethylene carbonate reduction on lithiated-graphite and lithium surfaces and constrained density functional theory to understand ethylene carbonate reduction on passivated electrode surfaces.

Leung, Kevin; Hudak, Nicholas S.; Liu, Yang; Liu, Xiaohua H.; Fan, Hongyou; Subramanian, Arunkumar; Shaw, Michael J.; Sullivan, John Patrick; Huang, Jian Yu

2012-01-01T23:59:59.000Z

86

Correlation between resistance-change effect in transition-metal oxides and secondary-electron contrast of scanning electron microscope images  

Science Conference Proceedings (OSTI)

Conductive atomic-force microscopy (C-AFM) writing is attracting attention as a technique for clarifying the switching mechanism of resistive random-access memory by providing a wide area filled with filaments, which can be regarded as one filament with large radius. The writing area on a nickel-oxide (NiO) film formed by conductive atomic-force microscopy was observed by scanning electron microscope, and a correlation between the contrast in a secondary-electron image (SEI) and the resistance written by C-AFM was revealed. In addition, the dependence of the SEI contrast on the beam accelerating voltage (V{sub accel}) suggests that the resistance-change effect occurs near the surface of the NiO film. As for the effects of electron irradiation and vacuum annealing on the C-AFM writing area, it was shown that the resistance-change effect is caused by exchange of oxygen with the atmosphere at the surface of the NiO film. This result suggests that the low-resistance and high-resistance areas are, respectively, p-type Ni{sub 1+{delta}}O ({delta} =} 0).

Kinoshita, K.; Kishida, S. [Department of Information and Electronics, Graduate School of Engineering, Tottori University, 4-101 Koyama-Minami, Tottori 680-8552 (Japan); Tottori University Electronic Display Research Center, 522-2 Koyama-Kita, Tottori 680-0941 (Japan); Yoda, T. [Department of Information and Electronics, Graduate School of Engineering, Tottori University, 4-101 Koyama-Minami, Tottori 680-8552 (Japan)

2011-09-15T23:59:59.000Z

87

In Situ Tensile Testing of Single Crystal Molybdenum Alloy Fibers with Various Dislocation Densities in a Scanning Electron Microscope  

SciTech Connect

In-situ tensile tests have been performed in a dual beam focused ion beam and scanning electron microscope on as-grown and prestrained single-crystal molybdenum-alloy (Mo-alloy) fibers. The fibers had approximately square cross sections with submicron edge lengths and gauge lengths in the range of 9-41 {mu}m. In contrast to previously observed yield strengths near the theoretical strength of 10 GPa in compression tests of {approx}1-3-{mu}m long pillars made from similar Mo-alloy single crystals, a wide scatter of yield strengths between 1 and 10 GPa was observed in the as-grown fibers tested in tension. Deformation was dominated by inhomogeneous plastic events, sometimes including the formation of Lueders bands. In contrast, highly prestrained fibers exhibited stable plastic flow, significantly lower yield strengths of {approx}1 GPa, and stress-strain behavior very similar to that in compression. A simple, statistical model incorporating the measured dislocation densities is developed to explain why the tension and compression results for the as-grown fibers are different.

George, Easo P [ORNL; Johanns, K. [University of Tennessee, Knoxville (UTK); Sedlmayr, A. [Karlsruhe Institute of Technology, Karlsruhe, Germany; Phani, P. Sudharshan [University of Tennessee, Knoxville (UTK); Monig, R. [Karlsruhe Institute of Technology, Karlsruhe, Germany; Kraft, O. [Karlsruhe Institute of Technology, Karlsruhe, Germany; Pharr, George M [University of Tennessee, Knoxville (UTK) & Oak Ridge National Laboratory (ORNL)

2012-01-01T23:59:59.000Z

88

Electron microscopic evaluation and fission product identification of irradiated TRISO coated particles from the AGR-1 experiment: A preliminary Study  

Science Conference Proceedings (OSTI)

ABSTRACT Post-irradiation examination of coated particle fuel from the AGR-1 experiment is in progress at Idaho National Laboratory and Oak Ridge National Laboratory. In this presentation a brief summary of results from characterization of microstructures in the coating layers of selected irradiated fuel particles with burnup of 11.3% and 19.3% FIMA will be given. The main objective of the characterization were to study irradiation effects, fuel kernel porosity, layer debonding, layer degradation or corrosion, fission-product precipitation, grain sizes, and transport of fission products from the kernels across the TRISO layers. Characterization techniques such as scanning electron microscopy, transmission electron microscopy, energy dispersive spectroscopy, and wavelength dispersive spectroscopy were used. A new approach to microscopic quantification of fission-product precipitates is also briefly demonstrated. The characterization emphasized fission-product precipitates in the SiC-IPyC interface, SiC layer and the fuel-buffer interlayer, and provided significant new insights into mechanisms of fission-product transport. Although Pd-rich precipitates were identified at the SiC-IPyC interlayer, no significant SiC-layer thinning was observed for the particles investigated. Characterization of these precipitates highlighted the difficulty of measuring low concentration Ag in precipitates with significantly higher concentrations of contain Pd and U. Different approaches to resolving this problem are discussed. Possible microstructural differences between particles with high and low releases of Ag particles are also briefly discussed, and an initial hypothesis is provided to explain fission-product precipitate compositions and locations. No SiC phase transformations or debonding of the SiC-IPyC interlayer as a result of irradiation were observed. Lessons learned from the post-irradiation examination are described and future actions are recommended.

I J van Rooyen; D E Janney; B D Miller; J L Riesterer; P A Demkowicz

2012-10-01T23:59:59.000Z

89

Reading Comprehension - Microscopes  

NLE Websites -- All DOE Office Websites (Extended Search)

Microscopes Microscopes It happened over 300 years _________ since ago before after in Holland. Anton van Leeuwenhoek (AN-tun van LAY-vun-hook) had a new microscope that he had _________ made lost previewed delivered . One day he _________ fell broke looked went through it at a drop of lake water. What he saw surprised him. The water was alive with what Leeuwenhoek called "wee beasties." The microscope made tiny organisms look 200 times _________ farther smaller darker larger than life size. Leeuwenhoek was one of the first scientists to see living things that were that _________ life small darker larger . His work was a giant _________ turtle gorilla step tower for science. Today, microscopes are much stronger. An electron microscope can make tiny organisms look 200,000 times _________ small over under life size. A few

90

NIST Studies How New Helium Ion Microscope Measures Up  

Science Conference Proceedings (OSTI)

... are studying helium ion microscopes to improve ... analogous to the scanning electron microscope, which was ... are far larger than electrons, they can ...

2012-11-02T23:59:59.000Z

91

No Job Name  

NLE Websites -- All DOE Office Websites (Extended Search)

of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5- Information Limit C. Kisielowski, 1 B. Freitag, 5 M. Bischoff,...

92

Non-destructive observation of in-grown stacking faults in 4H-SiC epitaxial layer using mirror electron microscope  

SciTech Connect

Mirror electron microscope (MEM) observation has been conducted for a 4-{mu}m-thick n-doped 4H-SiC epitaxial layer. If the sample is simultaneously illuminated with ultraviolet (UV) light of a slightly greater energy than the bandgap energy of 4H-SiC, in-grown stacking faults (IGSFs) can be clearly observed in MEM images. These observations were performed non-destructively, as almost all irradiated electrons returned without impinging the sample surface due to the negative voltage applied to the sample. High spatial resolution observation via MEM showed that multiple IGSFs were stacked up. The phenomenon in which the contrast of the IGSFs vanished in the absence of UV illumination and under UV illumination with a lower energy than the bandgap energy revealed that the origin of the contrast was the negative charging of IGSFs trapping electrons excited by UV light.

Hasegawa, Masaki; Ohno, Toshiyuki [Central Research Laboratory, Hitachi Ltd., 1-280, Higashi-koigakubo, Kokubunji, Tokyo 185-8601 (Japan)

2011-10-01T23:59:59.000Z

93

Note: Direct measurement of the point-to-point resolution for microns-thick specimens in the ultrahigh-voltage electron microscope  

SciTech Connect

We report on a direct measurement method and results of the point-to-point resolution for microns-thick amorphous specimens in the ultrahigh-voltage electron microscope (ultra-HVEM). We first obtain the ultra-HVEM images of nanometer gold particles with different sizes on the top surfaces of the thick epoxy-resin specimens. Based on the Rayleigh criterion, the point-to-point resolution is then determined as the minimum distance between centers of two resolvable tangent gold particles. Some values of resolution are accordingly acquired for the specimens with different thicknesses at the accelerating voltage of 2 MV, for example, 18.5 nm and 28.4 nm for the 5 {mu}m and 8 {mu}m thick epoxy-resin specimens, respectively. The presented method and results provide a reliable and useful approach to quantifying and comparing the achievable spatial resolution for the thick specimens imaged in the mode of transmission electron including the scanning transmission electron microscope.

Wang Fang; Cao Meng; Zhang Haibo [Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049 (China); Nishi, Ryuji; Takaoka, Akio [Research Center for Ultrahigh-Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047 (Japan)

2011-06-15T23:59:59.000Z

94

Nanosecond in situ transmission electron microscope studies of the reversible Ge{sub 2}Sb{sub 2}Te{sub 5} crystalline <==> amorphous phase transformation  

SciTech Connect

Chalcogenide-based phase-change materials have wide use in optical recording media and are growing in importance for use in non-volatile electronic memory. For both applications, rapid switching between the amorphous and crystalline phases is necessary, and understanding the changes during rapidly driven phase transitions is of scientific and technological significance. Laser-induced crystallization and amorphization occur rapidly and changes in atomic structure, microstructure, and temperature are difficult to observe experimentally and determine computationally. We have used nanosecond-scale time-resolved diffraction with intense electron pulses to study Ge{sub 2}Sb{sub 2}Te{sub 5} during laser crystallization. Using a unique and unconventional specimen geometry, cycling between the amorphous and crystalline phases was achieved, enabling in situ transmission electron microscope (TEM) study of both microstructural and crystallographic changes caused by repeated switching. Finite element analysis was used to simulate interactions of the laser with the nano-structured specimens and to model the rapidly changing specimen temperature. Such time-resolved experimental methods combined with simulation of experimentally inaccessible physical characteristics will be fundamental to advancing the understanding of rapidly driven phase transformations.

Santala, M. K.; Reed, B. W.; LaGrange, T.; Campbell, G. H.; Browning, N. D. [Condensed Matter and Materials Division, Lawrence Livermore National Laboratory, Livermore, California 94551 (United States); Topuria, T. [IBM Research Division, Almaden Research Center, San Jose, California 95120 (United States); Raoux, S. [IBM T. J. Watson Research Center, Yorktown Heights, New York 10598 (United States); Meister, S. [Intel Corporation, Hillsboro, Oregon 97124 (United States); Cui, Y. [Department of Materials Science and Engineering, Stanford University, Stanford, California 94305 (United States)

2012-01-15T23:59:59.000Z

95

Ultrafast supercontinuum fiber-laser based pump-probe scanning MOKE microscope for the investigation of electron spin dynamics in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution  

E-Print Network (OSTI)

We describe a two-color pump-probe scanning magneto-optical Kerr effect (MOKE) microscope which we have developed to investigate electron spin phenomena in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution. The key innovation of our microscope is the usage of an ultrafast `white light' supercontinuum fiber-laser source which provides access to the whole visible and near-infrared spectral range. Our Kerr microscope allows for the independent selection of the excitation and detection energy while avoiding the necessity to synchronize the pulse trains of two separate picosecond laser systems. The ability to independently tune the pump and probe wavelength enables the investigation of the influence of excitation energy on the optically induced electron spin dynamics in semiconductors. We demonstrate picosecond real-space imaging of the diffusive expansion of optically excited electron spin packets in a (110) GaAs quantum well sample to illustrate the capabilities of t...

Henn, T; Ossau, W; Molenkamp, L W; Biermann, K; Santos, P V

2013-01-01T23:59:59.000Z

96

Effect of high-energy electron irradiation in an electron microscope column on fluorides of alkaline earth elements (CaF{sub 2}, SrF{sub 2}, and BaF{sub 2})  

SciTech Connect

The effect of high-energy (150 eV) electron irradiation in an electron microscope column on crystals of fluorides of alkaline earth elements CaF{sub 2}, SrF{sub 2}, and BaF{sub 2} is studied. During structural investigations by electron diffraction and electron microscopy, the electron irradiation causes chemical changes in MF{sub 2} crystals such as the desorption of fluorine and the accumulation of oxygen in the irradiated area with the formation of oxide MO. The fluorine desorption rate increases significantly when the electron-beam density exceeds the threshold value of {approx}2 Multiplication-Sign 10{sup 3} pA/cm{sup 2}). In BaF{sub 2} samples, the transformation of BaO into Ba(OH){sub 2} was observed when irradiation stopped. The renewal of irradiation is accompanied by the inverse transformation of Ba(OH){sub 2} into BaO. In the initial stage of irradiation of all MF{sub 2} compounds, the oxide phase is in the single-crystal state with a lattice highly matched with the MF{sub 2} matrix. When the irradiation dose is increased, the oxide phase passes to the polycrystalline phase. Gaseous products of MF{sub 2} destruction (in the form of bubbles several nanometers in diameter) form a rectangular array with a period of {approx}20 nm in the sample.

Nikolaichik, V. I. [Russian Academy of Sciences, Institute of Microelectronics Technology and High Purity Materials (Russian Federation); Sobolev, B. P., E-mail: sobolev@ns.crys.ras.ru; Zaporozhets, M. A.; Avilov, A. S. [Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)

2012-03-15T23:59:59.000Z

97

Evaluation of the Extent of Electron Scattering in a Low ...  

Science Conference Proceedings (OSTI)

... of low vacuum scanning electron microscopes has been ... by all scanning electron microscope vendors. ... can help dissipate electrons that accumulate ...

2012-10-02T23:59:59.000Z

98

Effect of residual chips on the material removal process of the bulk metallic glass studied by in situ scratch testing inside the scanning electron microscope  

Science Conference Proceedings (OSTI)

Research on material removal mechanism is meaningful for precision and ultra-precision manufacturing. In this paper, a novel scratch device was proposed by integrating the parasitic motion principle linear actuator. The device has a compact structure and it can be installed on the stage of the scanning electron microscope (SEM) to carry out in situ scratch testing. Effect of residual chips on the material removal process of the bulk metallic glass (BMG) was studied by in situ scratch testing inside the SEM. The whole removal process of the BMG during the scratch was captured in real time. Formation and growth of lamellar chips on the rake face of the Cube-Corner indenter were observed dynamically. Experimental results indicate that when lots of chips are accumulated on the rake face of the indenter and obstruct forward flow of materials, materials will flow laterally and downward to find new location and direction for formation of new chips. Due to similar material removal processes, in situ scratch testing is potential to be a powerful research tool for studying material removal mechanism of single point diamond turning, single grit grinding, mechanical polishing and grating fabrication.

Huang Hu; Zhao Hongwei; Shi Chengli; Wu Boda; Fan Zunqiang; Wan Shunguang; Geng Chunyang [College of Mechanical Science and Engineering, Jilin University, Renmin Street 5988, Changchun, Jilin 130025 (China)

2012-12-15T23:59:59.000Z

99

Microscope and method of use  

SciTech Connect

A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers.

Bongianni, Wayne L. (Los Alamos, NM)

1984-01-01T23:59:59.000Z

100

Electronic  

NLE Websites -- All DOE Office Websites (Extended Search)

contribution contribution to friction on GaAs: An atomic force microscope study Yabing Qi, 1,2 J. Y. Park, 2 B. L. M. Hendriksen, 2 D. F. Ogletree, 2 and M. Salmeron 2,3 1 Applied Science and Technology Graduate Group, University of California, Berkeley, California 94720, USA 2 Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720, USA 3 Department of Materials Sciences and Engineering, University of California, Berkeley, California 94720, USA ͑Received 23 January 2008; revised manuscript received 11 April 2008; published 7 May 2008͒ The electronic contribution to friction at semiconductor surfaces was investigated by using a Pt-coated tip with 50 nm radius in an atomic force microscope sliding against an n-type GaAs͑100͒ substrate. The GaAs surface was covered by an approximately 1 nm thick oxide layer. Charge accumulation

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


101

Solid state optical microscope  

DOE Patents (OSTI)

A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal. 2 figs.

Young, I.T.

1983-08-09T23:59:59.000Z

102

Solid state optical microscope  

DOE Patents (OSTI)

A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

Young, Ian T. (Pleasanton, CA)

1983-01-01T23:59:59.000Z

103

Electron Microscopy (EM, TEM, SEM, STEM) Information at ...  

Science Conference Proceedings (OSTI)

... Electron holography. Electron Microscopy of Carbon Nanotube Composites. Environmental Scanning Electron Microscope. ...

2010-10-05T23:59:59.000Z

104

Magnetodynamics and Spin Electronics  

Science Conference Proceedings (OSTI)

... Spintronics exploits the interaction between electrons' spin angular momentum ... stochastic processes in the form of electron microscope images of ...

2013-05-13T23:59:59.000Z

105

Atomic-resolution Chemical Analysis by Aberration-corrected ...  

Science Conference Proceedings (OSTI)

In fact, it is possible to analyze materials in the atomic resolution since both the ... State-of-the-art strain Microscopy for Ferroelectrics and Battery Materials.

106

Spin microscope based on optically detected magnetic resonance  

DOE Patents (OSTI)

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2010-07-13T23:59:59.000Z

107

Spin microscope based on optically detected magnetic resonance  

Science Conference Proceedings (OSTI)

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2009-10-27T23:59:59.000Z

108

Spin microscope based on optically detected magnetic resonance  

SciTech Connect

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2010-06-29T23:59:59.000Z

109

Spin microscope based on optically detected magnetic resonance  

DOE Patents (OSTI)

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of impaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2009-11-10T23:59:59.000Z

110

Spin microscope based on optically detected magnetic resonance  

SciTech Connect

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2007-12-11T23:59:59.000Z

111

Getting the Point: Real-Time Monitoring of Atomic-Microscope ...  

Science Conference Proceedings (OSTI)

... done with atomic force microscopy (AFM). ... small scales, so researchers use atomic force microscopes. ... of the tip with an electron microscope, a time ...

2012-10-15T23:59:59.000Z

112

A multilayer grating with a novel layer structure for a flat-field spectrograph attached to transmission electron microscopes in energy region of 2-4 keV  

SciTech Connect

A multilayer mirror with a novel layer structure to uniformly enhance the reflectivity in a few keV energy range at a fixed angle of incidence is invented and applied to a multilayer grating for use in a flat-field spectrograph attached to a conventional electron microscope. The diffraction efficiency of the fabricated multilayer grating having the new layer structure is evaluated at the angle of incidence of 88.65 deg. in the energy region of 2.1-4.0 keV. It is shown that the multilayer grating is effective to uniformly enhance the diffraction efficiency and able to be practically used in this energy region.

Imazono, T.; Koike, M.; Koeda, M.; Nagano, T.; Sasai, H.; Oue, Y.; Yonezawa, Z.; Kuramoto, S.; Terauchi, M.; Takahashi, H.; Handa, N.; Murano, T. [QuBS, Japan Atomic Energy Agency (JAEA), 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215 (Japan); Device Dept., Shimadzu Corp., 1 Nishinokyo-Kuwabarcho, Nakagyo-ku, Kyoto 604-8511 (Japan); IMRAM, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577 (Japan); EC Business Unit, JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558 (Japan)

2012-05-17T23:59:59.000Z

113

The TEAM Project: Who is building the TEAM microscope?  

NLE Websites -- All DOE Office Websites (Extended Search)

Who is building the TEAM microscope? Led by Lawrence Berkeley National Laboratory's National Center for Electron Microscopy, TEAM is an intensive collaborative project with...

114

On thermodynamic and microscopic reversibility  

E-Print Network (OSTI)

On Thermodynamic and Microscopic Reversibility Abstract. Theof the University of California. On Thermodynamic andMicroscopic Reversibility Thermodynamic reversibility The

Crooks, Gavin E.

2012-01-01T23:59:59.000Z

115

Recurrence Tracking Microscope  

E-Print Network (OSTI)

In order to probe nanostructures on a surface we present a microscope based on the quantum recurrence phenomena. A cloud of atoms bounces off an atomic mirror connected to a cantilever and exhibits quantum recurrences. The times at which the recurrences occur depend on the initial height of the bouncing atoms above the atomic mirror, and vary following the structures on the surface under investigation. The microscope has inherent advantages over existing techniques of scanning tunneling microscope and atomic force microscope. Presently available experimental technology makes it possible to develop the device in the laboratory.

Farhan Saif

2006-04-04T23:59:59.000Z

116

Microscopes - Teacher Overview  

NLE Websites -- All DOE Office Websites (Extended Search)

Standards of Learning Download this Activity Background: With the invention of the microscope, scientist could see things they never could before. They discovered that we were...

117

Towards a Neutron Microscope  

Science Conference Proceedings (OSTI)

Towards a Neutron Microscope. Summary: ... The novel lens is a Wolter Optic similar in design to the telescope of the CHANDRA x-ray observatory. ...

2013-07-23T23:59:59.000Z

118

Microscopic Properties of Horizons  

E-Print Network (OSTI)

We suggest that all horizons of spacetime, no matter whether they are black hole, Rindler or de Sitter horizons, have certain microscopic properties in common. We propose that these propertues may be used as the starting points, or postulates, of a microscopic theory of gravity.

Jarmo Makela

2001-08-13T23:59:59.000Z

119

Single atom identification by energy dispersive x-ray spectroscopy  

SciTech Connect

Using aberration-corrected scanning transmission electron microscope and energy dispersive x-ray spectroscopy, single, isolated impurity atoms of silicon and platinum in monolayer and multilayer graphene are identified. Simultaneously acquired electron energy loss spectra confirm the elemental identification. Contamination difficulties are overcome by employing near-UHV sample conditions. Signal intensities agree within a factor of two with standardless estimates.

Lovejoy, T. C.; Dellby, N.; Krivanek, O. L. [Nion, 1102 8th St., Kirkland, Washington 98033 (United States); Ramasse, Q. M. [SuperSTEM Laboratory, STFC Daresbury, Keckwick Lane, Daresbury WA4 4AD (United Kingdom); Falke, M.; Kaeppel, A.; Terborg, R. [Bruker Nano GmbH, Schwarzschildstr. 12, 12489 Berlin (Germany); Zan, R. [School of Physics and Astronomy, University of Manchester, Manchester M13 9PL (United Kingdom)

2012-04-09T23:59:59.000Z

120

Genomics of Electronic Materials  

Science Conference Proceedings (OSTI)

... Metamaterials; Highly correlated electron materials, eg superconductors, such as ... A near-field scanning microwave microscope for characterization ...

2013-08-08T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


121

Solid-state optical microscope  

DOE Patents (OSTI)

A solid state optical microscope is described wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. Means for scanning in one of two orthogonal directions are provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

Young, I.T.

1981-01-07T23:59:59.000Z

122

Microscope collision protection apparatus  

DOE Patents (OSTI)

A microscope collision protection apparatus for a remote control microscope which protects the optical and associated components from damage in the event of an uncontrolled collision with a specimen, regardless of the specimen size or shape. In a preferred embodiment, the apparatus includes a counterbalanced slide for mounting the microscope's optical components. This slide replaces the rigid mounts on conventional upright microscopes with a precision ball bearing slide. As the specimen contacts an optical component, the contacting force will move the slide and the optical components mounted thereon. This movement will protect the optical and associated components from damage as the movement causes a limit switch to be actuated, thereby stopping all motors responsible for the collision.

DeNure, Charles R. (Pocatello, ID)

2001-10-23T23:59:59.000Z

123

A high-resolution field-emission-gun, scanning electron microscope investigation of anisotropic hydrogen decrepitation in Nd-Fe-B-based sintered magnets  

SciTech Connect

In this investigation commercial magnets based on (Nd,Dy){sub 14}(Fe,Co){sub 79}B{sub 7} were prepared by a conventional powder-metallurgy route with a degree of alignment equal to {approx}90% and then exposed to hydrogen at a pressure of 1 bar. The magnets, in the form of cylinders, were observed to decrepitate exclusively from the ends. High-resolution electron microscopy was able to identify the presence of crack formation within the Nd{sub 2}Fe{sub 14}B grains, with the cracks running parallel to the c axis of these grains. Based on the concentration profile for hydrogen in a rare-earth transition-metal material, it is clear that the presence of hydrogen-induced cracks running perpendicular to the ends of the magnet provides for a much more rapidly progressing hydrogen front in this direction than from the sides of the magnet. This results in the magnet exhibiting a macroscopic tendency to decrepitate from the poles of the magnet toward the center. This combination of microstructural modification via particle alignment as part of the sintering process and direct observation via high-resolution electron microscopy has led to a satisfying explanation for the anisotropic hydrogen-decrepitation effect.

Soderznik, Marko; McGuiness, Paul; Zuzek-Rozman, Kristina; Kobe, Spomenka [Department for Nanostructured Materials, Jozef Stefan Institute, Ljubljana 1000 (Slovenia); Skulj, Irena [Magneti Ljubljana, d.d., Stegne 37, 1000, Ljubljana (Slovenia); Yan Gaolin [School of Physics and Technology, Wuhan University, Wuhan 430072 (China)

2010-05-15T23:59:59.000Z

124

Infrared microscope inspection apparatus  

DOE Patents (OSTI)

Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.

Forman, S.E.; Caunt, J.W.

1985-02-26T23:59:59.000Z

125

Transmission Electron Microscope Study on Electrodeposited Gd2O3 and Gd2Zr2O7 Buffer Layers forYBa2Cu307-..delta.. Superconductors  

SciTech Connect

We have investigated the microstructures of electrodeposited Gd{sub 2}O{sub 3} (GO) and Gd{sub 2}Zr{sub 2}O{sub 7} (GZO) buffer layers for YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) superconductors with conventional transmission electron microscopy (TEM). A high density of nanoscale voids was present in the GZO buffer layers. No voids were observed in GO buffer layers grown on GZO. YBCO superconductor grown on the GO/GZO buffer layer structure produced a critical current density (J{sub c}) of 3.3 x 10{sup 6} A/cm{sup 2} at 77 K in zero field.

Zhao, W.; Norman, A.; Phok, S.; Bhattacharya, R.

2008-01-01T23:59:59.000Z

126

Molecular image resolution in electron microscopy  

Science Conference Proceedings (OSTI)

In order to determine the ultimate molecular resolution attainable with a conventional electron microscope

Natsu Uyeda; Takashi Kobayashi; Eiji Suito; Yoshiyasu Harada

1972-01-01T23:59:59.000Z

127

Scanning Tunneling Microscopic Characterization of Electron ...  

Science Conference Proceedings (OSTI)

... (7.15nS) for dDT and two order of magnitude larger (0.078nS) than hDT. ... Formation of Silver Nanocube Array via Silica-Polymer Nanocomposites ... of Cu- Nb Multilayers as a Function of Dislocation/Disconnection Content ... Synthesis of W–25 Wt%Cu Composite Powders Using Ammonium Para Tungstate and Copper ...

128

Ion photon emission microscope  

DOE Patents (OSTI)

An ion beam analysis system that creates microscopic multidimensional image maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the ion-induced photons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted photons are collected in the lens system of a conventional optical microscope, and projected on the image plane of a high resolution single photon position sensitive detector. Position signals from this photon detector are then correlated in time with electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these photons initially.

Doyle, Barney L. (Albuquerque, NM)

2003-04-22T23:59:59.000Z

129

A Microscopic Double-Slit Experiment  

NLE Websites -- All DOE Office Websites (Extended Search)

A Microscopic Double-Slit A Microscopic Double-Slit Experiment A Microscopic Double-Slit Experiment Print Wednesday, 29 February 2012 00:00 Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in establishing the validity of wave-particle duality, a puzzling concept that has ultimately become central to the interpretation of complementarity in quantum mechnanics. In a new twist on this classic experiment, the double slit (with light waves) has been replaced by a diatomic molecule (with electron waves). At ALS Beamline 10.0.1, researchers have shown that diatomic molecules can serve as two-center emitters of electron waves and that traces of electron-wave interference can be directly observed in precise measurements of vibrationally resolved photoionization spectra.

130

NCEM National Center for Electron Microscopy: SPLEEM  

NLE Websites -- All DOE Office Websites (Extended Search)

SPLEEM The Spin-Polarized Low-Energy Electron Microscope is a unique low-voltage electron microscope for the study of surfaces and interfaces. The instrument is very sensitive to...

131

Sandia National Laboratories: News: Publications: Lab News  

NLE Websites -- All DOE Office Websites (Extended Search)

June 1, 2012 June 1, 2012 Small worlds come into focus with new Sandia instrument PRINCIPAL INVESTIGATORS Paul Kotula, left, and Ping Lu (both 1822) show off Sandia's new aberration-corrected scanning transmission electron microscope, which has a unique combination of X-ray detectors and very high resolution and is capable of doing analyses in far less time than the Labs' older analytic microscope. (Photo by Randy Montoya) View large image. by Sue Major Holmes Paul Kotula recently told a colleague at another laboratory that Sandia's new aberration-corrected scanning transmission electron microscope (AC-STEM) was like a Lamborghini with James Bond features. The $3.2 million FEI Titan G2 8200 Sandia accepted in February is 50 to 100 times better than what went before in terms of resolution and the time it

132

A Microscopic Double-Slit Experiment  

NLE Websites -- All DOE Office Websites (Extended Search)

A Microscopic Double-Slit Experiment Print A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in establishing the validity of wave-particle duality, a puzzling concept that has ultimately become central to the interpretation of complementarity in quantum mechnanics. In a new twist on this classic experiment, the double slit (with light waves) has been replaced by a diatomic molecule (with electron waves). At ALS Beamline 10.0.1, researchers have shown that diatomic molecules can serve as two-center emitters of electron waves and that traces of electron-wave interference can be directly observed in precise measurements of vibrationally resolved photoionization spectra.

133

A Microscopic Double-Slit Experiment  

NLE Websites -- All DOE Office Websites (Extended Search)

A Microscopic Double-Slit Experiment Print A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in establishing the validity of wave-particle duality, a puzzling concept that has ultimately become central to the interpretation of complementarity in quantum mechnanics. In a new twist on this classic experiment, the double slit (with light waves) has been replaced by a diatomic molecule (with electron waves). At ALS Beamline 10.0.1, researchers have shown that diatomic molecules can serve as two-center emitters of electron waves and that traces of electron-wave interference can be directly observed in precise measurements of vibrationally resolved photoionization spectra.

134

On thermodynamic and microscopic reversibility  

SciTech Connect

The word 'reversible' has two (apparently) distinct applications in statistical thermodynamics. A thermodynamically reversible process indicates an experimental protocol for which the entropy change is zero, whereas the principle of microscopic reversibility asserts that the probability of any trajectory of a system through phase space equals that of the time reversed trajectory. However, these two terms are actually synonymous: a thermodynamically reversible process is microscopically reversible, and vice versa.

Crooks, Gavin E.

2011-07-12T23:59:59.000Z

135

HIGH TEMPERATURE MICROSCOPE AND FURNACE  

DOE Patents (OSTI)

A high-temperature microscope is offered. It has a reflecting optic situated above a molten specimen in a furnace and reflecting the image of the same downward through an inert optic member in the floor of the furnace, a plurality of spaced reflecting plane mirrors defining a reflecting path around the furnace, a standard microscope supported in the path of and forming the end terminus of the light path.

Olson, D.M.

1961-01-31T23:59:59.000Z

136

Are Electron Tweezers Possible? Apparently So.  

Science Conference Proceedings (OSTI)

... metallurgist Vladimir Oleshko, you might expect that a beam of focused electrons—such as that created by a transmission electron microscope (TEM ...

2012-10-02T23:59:59.000Z

137

Reading Comprehension - Dissecting and Compound Microscopes  

NLE Websites -- All DOE Office Websites (Extended Search)

Dissecting and Compound Microscopes Two types of microscopes. _________ Dissecting and Compound Microscopes Two types of microscopes. _________ Dissecting Microscope Compound Microscope _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ Dissecting Microscope Compound Microscope _________ eyepieces focus knob light light switch objective stage _________ eyepieces focus knob light light switch objective stage _________ eyepieces focus knob light light switch objective stage _________ eyepieces focus knob light

138

The History of the Microscope  

NLE Websites -- All DOE Office Websites (Extended Search)

the Microscope the Microscope Nature Bulletin No. 506 November 9, 1957 Forest Preserve District of Cook County Daniel Ryan, President Roberts Mann, Conservation Editor David H. Thompson, Senior Naturalist THE HISTORY OF THE MICROSCOPE During that historic period known as the Renaissance, after the "dark" Middle Ages, there occurred the inventions of printing, gunpowder and the mariner's compass, followed by the discovery of America. Equally remarkable was the invention of the microscope: an instrument that enables the human eye, by means of a lens or combinations of lenses, to observe enlarged images of tiny objects. It made visible the fascinating details of worlds within worlds. Long before, in the hazy unrecorded past, someone picked up a piece of transparent crystal thicker in the middle than at the edges, looked through it, and discovered that it made things look larger. Someone also found that such a crystal would focus the sun's rays and set fire to a piece of parchment or cloth. Magnifiers and "burning glasses" are mentioned in the writings of Seneca and Pliny the Elder, Roman philosophers during the first century A. D., but apparently they were not used much until the invention of spectacles, toward the end of the 13th century. They were named lenses because they are shaped like the seeds of a lentil.

139

Hyperbaric hydrothermal atomic force microscope  

SciTech Connect

A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

Knauss, Kevin G. (Livermore, CA); Boro, Carl O. (Milpitas, CA); Higgins, Steven R. (Laramie, WY); Eggleston, Carrick M. (Laramie, WY)

2002-01-01T23:59:59.000Z

140

Scanning Electron Microscopy (SEM)  

Science Conference Proceedings (OSTI)

...The scanning electron microscope provides a valuable combination of high resolution imaging, elemental analysis, and recently, crystallographic analysis: Imaging of features as small as sim 10 nm or less, roughly 100 times smaller than can be seen with...

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


141

Historical Publications of the Electron Physics Group, 1980 ...  

Science Conference Proceedings (OSTI)

... of Spin Polarized Secondary Electrons in Transition ... Analysis in a Scanning Electron Microscope, J. Unguris ... and DT Pierce, J. Microscopy 139, RP1 ...

2013-04-26T23:59:59.000Z

142

Regular Scanning Tunneling Microscope Tips can be Intrinsically Chiral  

Science Conference Proceedings (OSTI)

We report our discovery that regular scanning tunneling microscope tips can themselves be chiral. This chirality leads to differences in electron tunneling efficiencies through left- and right-handed molecules, and, when using the tip to electrically excite molecular rotation, large differences in rotation rate were observed which correlated with molecular chirality. As scanning tunneling microscopy is a widely used technique, this result may have unforeseen consequences for the measurement of asymmetric surface phenomena in a variety of important fields.

Tierney, Heather L.; Murphy, Colin J.; Sykes, E. Charles H. [Department of Chemistry, Tufts University, Medford, Massachusetts 02155-5813 (United States)

2011-01-07T23:59:59.000Z

143

Neural network characterization of scanning electron microscopy  

Science Conference Proceedings (OSTI)

A scanning electron microscope (SEM) is a sophisticated equipment employed for fine imaging of processed film surfaces. In this study, a prediction model of scanning electron microscopy was constructed by using a generalized regression neural network ... Keywords: generalized regression neural network, genetic algorithm, model, scanning electron microscope, statistical experiment

Sanghee Kwon; Donghwan Kim; Byungwhan Kim

2008-07-01T23:59:59.000Z

144

Atomic force microscope: Enhanced sensitivity  

SciTech Connect

Atomic force microscopes (AFMs) are a recent development representing the state of the art in measuring ultrafine surface features. Applications are found in such fields of research as biology, microfabrication, material studies, and surface chemistry. Fiber-optic interferometer techniques developed at LLNL offer the potential of improving the vertical resolution of these instruments by up to 2 orders of magnitude. We are attempting to replace the current AFM measurement scheme, which consists of an optical beam deflection approach, with our fiber-optic interferometer scheme, a much more sensitive displacement measurement technique. In performing this research, we hope to accomplish two important goals; (1) to enhance the sensitivity of the AFM, and (2) to achieve important improvements in our fiber-optic interferometer technology.

Davis, D.T.

1995-06-01T23:59:59.000Z

145

Application of Precession Electron Diffraction in Density ...  

Science Conference Proceedings (OSTI)

In this paper, GND density calculations obtained using SEM-based EBSD and transmission electron microscope-based PED techniques in ?+? titanium alloys ...

146

Frontiers of In Situ Transmission Electron Microscopy  

Science Conference Proceedings (OSTI)

... significance and versatility of in situ transmission electron microscopy (TEM) has ... applied stimulus is observed as it happens inside the microscope. ...

2013-05-29T23:59:59.000Z

147

NIST Physicists 'Entangle' Microscopic Drum's Beat with ...  

Science Conference Proceedings (OSTI)

... entangled” a microscopic mechanical drum with electrical signals ... Entanglement has technological uses. ... cooled" the drum to a very low energy level ...

2013-10-22T23:59:59.000Z

148

NIST's New Scanning Probe Microscope is Supercool  

Science Conference Proceedings (OSTI)

... The microscope is mounted on a 6-ton granite table (4), also supported by pneumatic isolators. The cryostat (5) is mounted ...

2011-01-03T23:59:59.000Z

149

On the Precipitation of the Omega Phase in the Beta Matrix of ...  

Science Conference Proceedings (OSTI)

Understanding of beta to alpha phase transformation in beta titanium alloys will ... Aberration-Corrected Vector Field Electron Tomography of Magnetic Nano- ...

150

Scanning x-ray microscope  

Science Conference Proceedings (OSTI)

A scanning x-ray microscope is described including: an x-ray source capable of emitting a beam of x-rays; a collimator positioned to receive the beam of x-rays and to collimate this beam, a focusing cone means to focus the beam of x-rays, directed by the collimator, onto a focal plane, a specimen mount for supporting a specimen in the focal plane to receive the focused beam of x-rays, and x-ray beam scanning means to relatively move the specimen and the focusing cone means and collimator to scan the focused x-ray beam across the specimen. A detector is disposed adjacent the specimen to detect flourescent photons emitted by the specimen upon exposure to the focused beam of x-rays to provide an electrical output representative of this detection. Means are included for displaying and/or recording the information provided by the output from the detector, as are means for providing information to the recording and/or display means representative of the scan rate and position of the focused x-ray beam relative to the specimen whereby the recording and/or display means can correlate the information received to record and/or display quantitive and distributive information as to the quantity and distribution of elements detected in the specimen. Preferably there is provided an x-ray beam modulation means upstream, relative to the direction of emission of the xray beam, of the focusing cone means.

Wang, C.

1982-02-23T23:59:59.000Z

151

Highly Reproducible Nanolithography by Dynamic Plough of an Atomic-Force Microscope Tip and Thermal-Annealing Treatment  

Science Conference Proceedings (OSTI)

An approach has been developed to use atomic-force microscope (AFM) to pattern materials at the nanoscale in a controlled manner. By introducing a thermal-annealing process above the glass-transition temperature of poly (methylmethacrylate) (PMMA), the ... Keywords: 2-D electron gas, Atomic-force microscope (AFM), nanolithography, self-switching diodes (SSDs)

Xiaofeng Lu; C. Balocco; Fuhua Yang; A. M. Song

2011-01-01T23:59:59.000Z

152

Los Alamos: MST: MST-6: EML: Electron Microscopy Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) FEI Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) This is a versatile field emission scanning electron microscope integrated with a focused ion beam column that is used for sophisticated SEM and TEM sample preparation, micromachining, and ultrahigh resolution SEM imaging. The microscope is also equipped for x-ray microanalysis and crystallographic orientation imaging. Microscope consists of a Hexalens SFEG electron beam column, and a Magnum ion beam column with a gallium liquid metal ion source. Imaging with both secondary electrons and ions. Digital image acquisition. Small, stable, high brightness Schottky based field emission electron source provides 1.5 nm resolution at 30 kV. Three electron beam lens modes - normal imaging, high resolution imaging, and EDS imaging.

153

Disorder-Induced Microscopic Magnetic Memory  

NLE Websites -- All DOE Office Websites (Extended Search)

Disorder-Induced Microscopic Disorder-Induced Microscopic Magnetic Memory Disorder-Induced Microscopic Magnetic Memory Print Wednesday, 26 October 2005 00:00 The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments, an American-European team, led by researchers from the University of Washington, Seattle, first developed and then applied coherent x-ray speckle metrology to microscopic magnetic domains in a series of thin multilayer perpendicular magnetic materials of varying disorder. Their results, at odds with all previous theories, have set a new reference point for future theories.

154

X-Ray diffraction analysis and transmission electron microscopic ...  

Science Conference Proceedings (OSTI)

eral in women with osteoporosis. Calcif Tissue Res 21:452-. 456. 6. Dahllof G, Lindskog S, Theorell K, Ussisoo R (1987) Con- comitant regional odontodysplasia ...

155

Zeiss Ultra-60 Field Emission Scanning Electron Microscope ...  

Science Conference Proceedings (OSTI)

... cover panels, particularly those on the electro-optic ... Units in the vacuum display windows can be ... mouse button) in the parameter display window. ...

2013-01-18T23:59:59.000Z

156

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

NLE Websites -- All DOE Office Websites (Extended Search)

3010 In-Situ 3010 In-Situ AEME The 300 kV JEOL 3010 offers greater specimen penetration than 200kV instruments, with significantly improved spatial resolution and probe forming capabilities. The side-entry stage allows ±45° tilt and can be operated with piezo-drift compensation. A flexible condenser system permits CBED, LACBED, and imaging with hollow cone and Koehler illumination. In addition to a standard film camera, a Gatan Orius CCD, and a Gatan 622 intensified TV camera and VCR are available for recording experiments at video rates. Specific capabilities include: high-resolution imaging at 2.1Å and ±40° tilt during simultaneous heating; very-high-resolution imaging at 1.7 Å and ±10° tilt during simultaneous heating; and high magnification Lorentz and Foucault imaging of magnetic samples. Various

157

Microscopic characterization of radionuclide contaminated soils to assist remediation efforts  

Science Conference Proceedings (OSTI)

A combination of optical, scanning, and analytical electron microscopies have been used to describe the nature of radionuclide contamination at several sites. These investigations were conducted to provide information for remediation efforts. This technique has been used successfully with uranium-contaminated soils from Fernald, OH, and Portsmouth, OH, thorium-contaminated soil from a plant in Tennessee, plutonium-contamination sand from Johnston Island in the Pacific Ocean, and incinerator ash from Los Alamos, NM. Selecting the most suitable method for cleaning a particular site is difficult if the nature of the contamination is not understood. Microscopic characterization allows the most appropriate method to be selected for removing the contamination and can show the effect a particular method is having on the soil. A method of sample preparation has been developed that allows direct comparison of scanning electron microscopy (SEM) and transmission electron microscopy (TEM) images, enabling characterization of TEM samples to be more representative of the bulk sample.

Buck, E.C.; Brown, N.R.; Dietz, N.L.; Fortner, J.A.; Bates, J.K.

1994-11-01T23:59:59.000Z

158

EMSL: Publications - Brochures  

NLE Websites -- All DOE Office Websites (Extended Search)

Brochures Brochures Become an EMSL User EMSL's Impact Accelerating Innovation Across America Grand Challenge Demonstrates Team Science, Generates Systems Understanding of Cyanobacterium EMSL/PNNL Catalysis Work Supports Cleaner, More Efficient Cummins/Dodge Engines Capability Groups at EMSL EMSL State-of-the-Art Capabilities Cell Isolation & Systems Analysis Deposition and Microfabrication Mass Spectrometry Microscopy Molecular Science Computing NMR and EPR Spectroscopy and Diffraction Subsurface Flow and Transport Instruments at EMSL Instruments Available to Users Instrument Series: Deposition and Microfabrication - Sputter Deposition System Instrument Series: Microscopy - Helium Ion Microscope Instrument Series: Microscopy - Aberration-Corrected Scanning/Transmission Electron Microscope (S/TEM)

159

Disorder-Induced Microscopic Magnetic Memory  

NLE Websites -- All DOE Office Websites (Extended Search)

Disorder-Induced Microscopic Magnetic Memory Print Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments, an American-European team, led by researchers from the University of Washington, Seattle, first developed and then applied coherent x-ray speckle metrology to microscopic magnetic domains in a series of thin multilayer perpendicular magnetic materials of varying disorder. Their results, at odds with all previous theories, have set a new reference point for future theories.

160

Laser Scanning Two Photon and Confocal Microscope  

Science Conference Proceedings (OSTI)

... The SP5 is a laser scanning two-photon and confocal microscope equipped with ... nm HeNe, and tunable IR (680 nm - 1060 nm) lasers * 4 internal ...

2012-10-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


161

Disorder-Induced Microscopic Magnetic Memory  

NLE Websites -- All DOE Office Websites (Extended Search)

Disorder-Induced Microscopic Magnetic Memory Print Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments, an American-European team, led by researchers from the University of Washington, Seattle, first developed and then applied coherent x-ray speckle metrology to microscopic magnetic domains in a series of thin multilayer perpendicular magnetic materials of varying disorder. Their results, at odds with all previous theories, have set a new reference point for future theories.

162

Soft x-ray laser microscope  

Science Conference Proceedings (OSTI)

The program consisted of two phases (Phase I and Phase II). The goal of the Phase I (first year program) was to design and construct the Soft X-ray Laser Contact Microscope. Such microscope was constructed and adapted to PPL's 18.2nm soft X-ray Laser (SXL), which in turn was modified and prepared for microscopy experiments. Investigation of the photoresist response to 18.2nm laser radiation and transmissivity of 0.1m thick silicion-nitride (Si[sub 3]N[sub 4]) windows were important initial works. The goal of the first year of Phase II was to construct X-ray contact microscope in combination with existing optical phase microscope, already used by biologists. In the second year of Phase II study of dehydrated Horeseshoe Crab and Hela cancer cells were performed with COXRALM. Also during Phase II, the Imaging X-Ray Laser Microscope (IXRALM) was designed and constructed. This paper describes the development of each of the microscopes and their application for research.

Suckewer, P.I.

1990-10-01T23:59:59.000Z

163

Highly charged ion based time of flight emission microscope  

DOE Patents (OSTI)

A highly charged ion based time-of-flight emission microscope has been designed, which improves the surface sensitivity of static SIMS measurements because of the higher ionization probability of highly charged ions. Slow, highly charged ions are produced in an electron beam ion trap and are directed to the sample surface. The sputtered secondary ions and electrons pass through a specially designed objective lens to a microchannel plate detector. This new instrument permits high surface sensitivity (10.sup.10 atoms/cm.sup.2), high spatial resolution (100 nm), and chemical structural information due to the high molecular ion yields. The high secondary ion yield permits coincidence counting, which can be used to enhance determination of chemical and topological structure and to correlate specific molecular species.

Barnes, Alan V. (Livermore, CA); Schenkel, Thomas (San Francisco, CA); Hamza, Alex V. (Livermore, CA); Schneider, Dieter H. (Livermore, CA); Doyle, Barney (Albuquerque, NM)

2001-01-01T23:59:59.000Z

164

Electron Microscopy Lab  

NLE Websites -- All DOE Office Websites (Extended Search)

Facilities » Facilities » Electron Microscopy Lab Electron Microscopy Lab Focusing on the study of microstructures with electron and ion beam instruments, including crystallographic and chemical techniques. April 12, 2012 Transmission electron microscope Rob Dickerson examines a multiphase oxide scale using the FEI Titan 80-300 transmission electron microscope. Contact Rob Dickerson (505) 667-6337 Email Rod McCabe (505) 606-1649 Email Pat Dickerson (505) 665-3036 Email Tom Wynn (505) 665-6861 Email Dedicated to the characterization of materials through imaging, chemical, and crystallographic analyses of material microstructures in support of Basic Energy Science, Laboratory Directed Research and Development, DoD, DOE, Work for Others, nuclear energy, and weapons programs. Go to full website »

165

Electronic Structure of Cobalt Nanocrystals Suspended in Liquid  

NLE Websites -- All DOE Office Websites (Extended Search)

layer made up of molecules of an organic surfactant (oleic acid). Bottom: Transmission electron microscope (TEM) image of cobalt nanocrystals. Scale bar 50 nm. Colloidal...

166

Microscopic Probes of High-Temperature Superconductivity  

Science Conference Proceedings (OSTI)

The granularity of the cuprate superconductors limits the effectiveness of many experimental probes that average over volumes containing many atoms. This report presents theoretical studies on muon spin relaxation and positron annihilation, two microscopic experimental techniques that can probe the properties of both high- and low-temperature superconductors on the atomic scale.

1992-07-01T23:59:59.000Z

167

Dynamic TEM: Observing In Situ Reactions with Nanometer and ...  

Science Conference Proceedings (OSTI)

Here, a summary of the DTEM and in-situ stages for both the existing microscope at LLNL and a new aberration corrected DTEM at UC-Davis will be described.

168

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

3000F High Resolution Transmission Electron Microscope 3000F High Resolution Transmission Electron Microscope JEOL 3000F High Resolution Transmission Electron Microscope This is a high-resolution TEM equipped with an electron energy-loss spectrometer and a CCD camera for digital image acquisition. This microscope is used primarily for imaging the atomic structure of defects and interfaces in materials. Field emission electron source. Coherent source with an energy spread of 0.8 eV. Operation at accelerating voltages of up to 300 kV. +/- 10° of eucentric specimen tilt. Point to point resolution of 0.17 nm; 0.10 nm resolution can be extracted by computer processing. Gatan Multiscan CCD Camera for digital image acquisition. Automated microscope alignment: defocus calibration/adjustment, astigmatism correction and beam-tilt correction (automatic coma-free alignment).

169

Acoustic microscope surface inspection system and method  

DOE Patents (OSTI)

An acoustic microscope surface inspection system and method in which pulses of high frequency electrical energy are applied to a transducer which forms and focuses acoustic energy onto a selected location on the surface of an object and receives energy from the location and generates electrical pulses. The phase of the high frequency electrical signal pulses are stepped with respected to the phase of a reference signal at said location. An output signal is generated which is indicative of the surface of said selected location. The object is scanned to provide output signals representative of the surface at a plurality of surface locations.

Khuri-Yakub, Butrus T. (Palo Alto, CA); Parent, Philippe (Chilly-Mazarin, FR); Reinholdtsen, Paul A. (Seattle, WA)

1991-01-01T23:59:59.000Z

170

Scanning tip microwave near field microscope  

SciTech Connect

A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

Xiang, Xiao-Dong (Alameda, CA); Schultz, Peter G. (Oakland, CA); Wei, Tao (Albany, CA)

1998-01-01T23:59:59.000Z

171

Microscopic Derivation of an Isothermal Thermodynamic Transformation  

E-Print Network (OSTI)

We obtain macroscopic isothermal thermodynamic transformations by space-time scalings of a microscopic Hamiltonian dynamics in contact with a heat bath. The microscopic dynamics is given by a chain of anharmonic oscillators subject to a varying tension (external force) and the contact with the heat bath is modeled by independent Langevin dynamics acting on each particle. After a diffusive space-time scaling and cross-graining, the profile of volume converges to the solution of a deterministic diffusive equation with boundary conditions given by the applied tension. This defines an irreversible thermodynamic transformation from an initial equilibrium to a new equilibrium given by the final tension applied. Quasi static reversible isothermal transformations are then obtained by a further time scaling. Heat is defined as the total flux of energy exchanged between the system and the heat bath. Then we prove that the relation between the limit heat, work, free energy and thermodynamic entropy agree with the first and second principle of thermodynamics.

Stefano Olla

2013-10-02T23:59:59.000Z

172

Microscopic Description of Nuclear Fission Dynamics  

E-Print Network (OSTI)

We discuss possible avenues to study fission dynamics starting from a time-dependent mean-field approach. Previous attempts to study fission dynamics using the time-dependent Hartree-Fock (TDHF) theory are analyzed. We argue that different initial conditions may be needed to describe fission dynamics depending on the specifics of the fission phenomenon and propose various approaches towards this goal. In particular, we provide preliminary calculations for studying fission following a heavy-ion reaction using TDHF with a density contraint. Regarding prompt muon-induced fission, we also suggest a new approach for combining the time-evolution of the muonic wave function with a microscopic treatment of fission dynamics via TDHF.

A. S. Umar; V. E. Oberacker; J. A. Maruhn; P. -G. Reinhard

2010-03-22T23:59:59.000Z

173

Chemical Power for Microscopic Robots in Capillaries  

E-Print Network (OSTI)

The power available to microscopic robots (nanorobots) that oxidize bloodstream glucose while aggregated in circumferential rings on capillary walls is evaluated with a numerical model using axial symmetry and time-averaged release of oxygen from passing red blood cells. Robots about one micron in size can produce up to several tens of picowatts, in steady-state, if they fully use oxygen reaching their surface from the blood plasma. Robots with pumps and tanks for onboard oxygen storage could collect oxygen to support burst power demands two to three orders of magnitude larger. We evaluate effects of oxygen depletion and local heating on surrounding tissue. These results give the power constraints when robots rely entirely on ambient available oxygen and identify aspects of the robot design significantly affecting available power. More generally, our numerical model provides an approach to evaluating robot design choices for nanomedicine treatments in and near capillaries.

Hogg, Tad

2009-01-01T23:59:59.000Z

174

Long working distance incoherent interference microscope  

DOE Patents (OSTI)

A full-field imaging, long working distance, incoherent interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. A long working distance greater than 10 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-dimensional height profiles of MEMS test structures to be acquired across an entire wafer while being actively probed, and, optionally, through a transparent window. An optically identical pair of sample and reference arm objectives is not required, which reduces the overall system cost, and also the cost and time required to change sample magnifications. Using a LED source, high magnification (e.g., 50.times.) can be obtained having excellent image quality, straight fringes, and high fringe contrast.

Sinclair, Michael B. (Albuquerque, NM); De Boer, Maarten P. (Albuquerque, NM)

2006-04-25T23:59:59.000Z

175

L1, Formation of Structural Defects in AlGaN/GaN High Electron ...  

Science Conference Proceedings (OSTI)

Transmission electron microscope (TEM) cross sectional image has shown that electrical degradation is closely related to structural damage in the GaN cap and  ...

176

The Use of Micro-X-ray Fluorescence in a Scanning Electron ...  

Science Conference Proceedings (OSTI)

An X-ray gun with focusing capillary fiber optics interfaced with a scanning electron microscope (SEM) is used for semi-quantitative XRF microanalysis by energy ...

177

Generalized drift-diffusion for microscopic thermoelectricity  

E-Print Network (OSTI)

Although thermoelectric elements increasingly incorporate nano-scale features in similar material systems as other micro-electronic devices, the former are described in the language of irreversible thermodynamics while ...

Santhanam, Parthiban

2009-01-01T23:59:59.000Z

178

Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope  

E-Print Network (OSTI)

We use a scanning tunneling microscope to probe single-electron charging phenomena in individual CdSe/ZnS (core/shell) quantum dots (QDs) at room temperature. The QDs are deposited on top of a bare Au thin film and form a ...

Bulovic, Vladimir

179

Inelastic X-ray Scattering Reveals Microscopic Transport Properties...  

NLE Websites -- All DOE Office Websites (Extended Search)

Inelastic X-ray Scattering Reveals Microscopic Transport Properties of Molten Aluminum Oxide The transport properties of high-temperature oxide melts are of considerable interest...

180

Atomic scale electron vortices for nanoresearch  

Science Conference Proceedings (OSTI)

Electron vortex beams were only recently discovered and their potential as a probe for magnetism in materials was shown. Here we demonstrate a method to produce electron vortex beams with a diameter of less than 1.2 Angst . This unique way to prepare free electrons to a state resembling atomic orbitals is fascinating from a fundamental physics point of view and opens the road for magnetic mapping with atomic resolution in an electron microscope.

Verbeeck, J.; Van Tendeloo, G. [EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp (Belgium); Schattschneider, P.; Loeffler, S. [Institute for Solid State Physics, Vienna University of Technology, Wiedner Hauptstrasse 8-10, A-1040 Wien (Austria); Lazar, S. [FEI Electron Optics, 5600 KA Eindhoven (Netherlands); Canadian Centre for Electron Microscopy and Department of Materials Science and Engineering, McMaster University, Main Street West, Hamilton Ontario, L8S4M1 (Canada); Stoeger-Pollach, M.; Steiger-Thirsfeld, A. [USTEM, Vienna University of Technology, Wiedner Hauptstrasse 8-10, A-1040 Wien (Austria)

2011-11-14T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


181

Braking system for use with an arbor of a microscope  

DOE Patents (OSTI)

A balanced braking system comprising a plurality of braking assemblies located about a member to be braked. Each of the braking assemblies consists of a spring biased piston of a first material fitted into a body of a different material which has a greater contraction upon cooling than the piston material. The piston is provided with a recessed head portion over which is positioned a diaphragm and forming a space therebetween to which is connected a pressurized fluid supply. The diaphragm is controlled by the fluid in the space to contact or withdraw from the member to be braked. A cooling device causes the body within which the piston is fitted to contract more than the piston, producing a tight shrink fit therebetween. The braking system is particularly applicable for selectively braking an arbor of an electron microscope which immobilizes, for example, a vertically adjustable low temperature specimen holder during observation. The system provides balanced braking forces which can be easily removed and re-established with minimal disturbance to arbor location.

Norgren, Duane U. (Orinda, CA)

1984-01-01T23:59:59.000Z

182

Shear Viscosity Coefficient from Microscopic Models  

E-Print Network (OSTI)

The transport coefficient of shear viscosity is studied for a hadron matter through microscopic transport model, the Ultra--relativistic Quantum Molecular Dynamics (UrQMD), using the Green--Kubo formulas. Molecular--dynamical simulations are performed for a system of light mesons in a box with periodic boundary conditions. Starting from an initial state composed of $\\pi, \\eta ,\\omega ,\\rho ,\\phi$ with a uniform phase--space distribution, the evolution takes place through elastic collisions, production and annihilation. The system approaches a stationary state of mesons and their resonances, which is characterized by common temperature. After equilibration, thermodynamic quantities such as the energy density, particle density, and pressure are calculated. From such an equilibrated state the shear viscosity coefficient is calculated from the fluctuations of stress tensor around equilibrium using Green--Kubo relations. We do our simulations here at zero net baryon density so that the equilibration times depend on the energy density. We do not include hadron strings as degrees of freedom so as to maintain detailed balance. Hence we do not get the saturation of temperature but this leads to longer equilibration times.

Azwinndini Muronga

2003-09-22T23:59:59.000Z

183

Compact, low power radio frequency cavity for femtosecond electron microscopy  

Science Conference Proceedings (OSTI)

Reported here is the design, construction, and characterization of a small, power efficient, tunable dielectric filled cavity for the creation of femtosecond electron bunches in an existing electron microscope without the mandatory use of femtosecond lasers. A 3 GHz pillbox cavity operating in the TM{sub 110} mode was specially designed for chopping the beam of a 30 keV scanning electron microscope. The dielectric material used is ZrTiO{sub 4}, chosen for the high relative permittivity ({epsilon}{sub r}= 37 at 10 GHz) and low loss tangent (tan {delta}= 2 x 10{sup -4}). This allows the cavity radius to be reduced by a factor of six, while the power consumption is reduced by an order of magnitude compared to a vacuum pillbox cavity. These features make this cavity ideal as a module for existing electron microscopes, and an alternative to femtosecond laser systems integrated with electron microscopes.

Lassise, A.; Mutsaers, P. H. A.; Luiten, O. J. [Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven (Netherlands)

2012-04-15T23:59:59.000Z

184

The R-curve response of ceramics with microscopic reinforcements: Reinforcement and additive effects  

SciTech Connect

Using direct observations with the scanning electron and optical microscopes, simultaneous measurements of fracture resistance versus crack length (R-curve behavior) and crack interactions with microstructural features at the crack tip and in its wake were made. Selecting whisker-reinforced aluminas and self-reinforced silicon nitrides, one can examine the effects of systematic modifications of microstructure and composition on the R-curve response and the mechanisms giving rise to it. Specifically, increases in whisker content and size can increase the R-Curve response, even for short crack lengths. In the self-reinforced silicon nitrides, changes in alumina: yttria additive ratios also modify the R-curve. Modeling of the R-curve response allows one to verify toughening mechanisms and, with experimental studies, to optimize the R-curve behavior in ceramics containing microscopic reinforcements, e.g., whiskers and elongated grain structures.

Becher, P.F.; Sun, E.Y.; Plucknett, K,P.; Hsueh, C.H.

1996-05-01T23:59:59.000Z

185

Model Development for Atomic Force Microscope Stage Mechanisms  

E-Print Network (OSTI)

Model Development for Atomic Force Microscope Stage Mechanisms Ralph C. Smith and Andrew G. Hatch of the Philippines Virginia Commonwealth University Diliman, Quezon City 1101 Richmond VA 23284 rcdelros titanate (PZT) devices employed in atomic force microscope stage mechanisms. We focus specifically on PZT

186

Experimental observation and quantum modeling of electron irradiation on single-wall carbon nanotubes  

Science Conference Proceedings (OSTI)

In situ experiments, based on electron irradiation at high temperature in a transmission electron microscope, are used to investigate isolated, packed and crossing single-wall nanotubes. During continuous, uniform atom removal, surfaces of isolated single-wall ...

J. -C. Charlier; M. Terrones; F. Banhart; N. Grobert; H. Terrones; P. M. Ajayan

2003-12-01T23:59:59.000Z

187

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Microscopy Laboratory, MST-6 Electron Microscopy Laboratory, MST-6 MST-6 Home Home In the MSL FEI Tecnai F30 Analytical TEM/STEM JEOL 6300FXV High Resolution SEM JEOL 3000F High Resolution Transmission Electron Microscope Philips XL30 F Scanning Electron Microscope & Orientation Imaging System Phillips CM30 Transmission Electron Microscope In the Sigma Building JEOL 840 EPMA with Wavelength Dispersive Spectroscopy FEI Strata DB235 FIB/SEM FEI XL30 Environmental Scanning Electron Microscope & Orientation Imaging System CONTACTS Bob Field 665.3938 Pat Dickerson 665.3036 Rob Dickerson 667.6337 Rod McCabe 606.1649 The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory (EML) is part of MST-6, the Materials Technology - Metallurgy Group within the Materials Science and Technology Division at Los Alamos National Laboratory. It is a facility dedicated to the characterization of materials primarily through imaging, chemical, and crystallographic analyses of material microstructures with several electron and ion beam instruments. Accessory characterization techniques and equipment include energy dispersive x-ray analysis (EDS), wavelength dispersive x-ray analysis (WDS), electron backscatter diffraction (EBSD) and orientation imaging microscopy (OIM), and electron energy loss spectroscopy (EELS).

188

Microscopic Analysis of Agricultural Products, 4th Edition  

Science Conference Proceedings (OSTI)

Written for both production staff who need advice on specific problems and development personnel who seek directions. Microscopic Analysis of Agricultural Products, 4th Edition Methods and Analyses Methods - Analyses Books Soft Bound Books Methods - An

189

Geometry-driven visualization of microscopic structures in biology  

Science Conference Proceedings (OSTI)

At a microscopic resolution, biological structures are composed of cells, red blood corpuscles (RBCs), cytoplasm and other microstructural components. There is a natural pattern in terms of distribution, arrangement and packing density of these components ...

Kishore Mosaliganti; Raghu Machiraju; Kun Huang; Gustavo Leone

2008-05-01T23:59:59.000Z

190

Soft x-ray laser microscope. Final report  

Science Conference Proceedings (OSTI)

The program consisted of two phases (Phase I and Phase II). The goal of the Phase I (first year program) was to design and construct the Soft X-ray Laser Contact Microscope. Such microscope was constructed and adapted to PPL`s 18.2nm soft X-ray Laser (SXL), which in turn was modified and prepared for microscopy experiments. Investigation of the photoresist response to 18.2nm laser radiation and transmissivity of 0.1m thick silicion-nitride (Si{sub 3}N{sub 4}) windows were important initial works. The goal of the first year of Phase II was to construct X-ray contact microscope in combination with existing optical phase microscope, already used by biologists. In the second year of Phase II study of dehydrated Horeseshoe Crab and Hela cancer cells were performed with COXRALM. Also during Phase II, the Imaging X-Ray Laser Microscope (IXRALM) was designed and constructed. This paper describes the development of each of the microscopes and their application for research.

Suckewer, P.I.

1990-10-01T23:59:59.000Z

191

Atmospheric pressure scanning transmission electron microscopy  

SciTech Connect

Scanning transmission electron microscope (STEM) images of gold nanoparticles (2.1 nm average diameter) at atmospheric pressure have been recorded through a 0.36 mm thick mixture of CO, O2 and He. This was accomplished using a reaction cell consisting of two electron-transparent silicon nitride membranes mounted on a specially designed specimen rod. Gas flow occurred through plastic tubing from the outside of the microscope to the specimen region and back. Gold nanoparticles of a full width half maximum diameter of 1.0 nm were visible above the background noise and the achieved resolution was 0.5 nm in accordance with calculations of the beam broadening.

De Jonge, Niels [ORNL; Veith, Gabriel M [ORNL; Bigelow, Wilbur C [ORNL

2010-01-01T23:59:59.000Z

192

Phase contrast in high resolution electron microscopy  

DOE Patents (OSTI)

This patent relates to a device for developing a phase contrast signal for a scanning transmission electron microscope. The lens system of the microscope is operated in a condition of defocus so that predictable alternate concentric regions of high and low electron density exist in the cone of illumination. Two phase detectors are placed beneath the object inside the cone of illumination, with the first detector having the form of a zone plate, each of its rings covering alternate regions of either higher or lower electron density. The second detector is so configured that it covers the regions of electron density not covered by the first detector. Each detector measures the number of electrons incident thereon and the signal developed by the first detector is subtracted from the signal developed by the record detector to provide a phase contrast signal. (auth)

Rose, H.H.

1975-09-23T23:59:59.000Z

193

Electron holography  

Science Conference Proceedings (OSTI)

... An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. ...

2013-01-08T23:59:59.000Z

194

A population global optimization algorithm to solve the image alignment problem in electron crystallography  

Science Conference Proceedings (OSTI)

Knowledge of the structure of biological specimens is critical to understanding their function. Electron crystallography is an electron microscopy (EM) approach that derives the 3D structure of specimens at high-resolution, even at atomic detail. Prior ... Keywords: Electron crystallography, Electron microscope tomography, Evolutionary algorithms, Global optimization, Image alignment, Stochastic optimization

P. M. Ortigosa; J. L. Redondo; I. García; J. J. Fernández

2007-04-01T23:59:59.000Z

195

Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy  

Science Conference Proceedings (OSTI)

The thermal budget involved in processing high-k gate stacks can cause undesirable physical and chemical changes which limit device performance. The transmission electron microscope and associated analytical techniques provide a way of investigating ... Keywords: Electron energy loss near edge structure, Electron energy loss spectroscopy, High-k dielectrics, Nanoanalytical electron microscopy

A. J. Craven; M. MacKenzie; D. W. McComb; F. T. Docherty

2005-06-01T23:59:59.000Z

196

Laser excited confocal microscope fluorescence scanner and method  

DOE Patents (OSTI)

A fluorescent scanner for scanning the fluorescence from a fluorescence labeled separated sample on a sample carrier including a confocal microscope for illuminating a predetermined volume of the sample carrier and/or receiving and processing fluorescence emissions from said volume to provide a display of the separated sample.

Mathies, Richard A. (Contra Costa, CA); Peck, Konan (Contra Costa, CA)

1992-01-01T23:59:59.000Z

197

Malaria Parasite Detection: Automated Method Using Microscope Color Image  

Science Conference Proceedings (OSTI)

Healthcare Delivery Systems are becoming overloaded in developing countries like India and China. It is imperative that more efficient and cost effective processes are employed. One such requirement is the automatic detection of malaria parasites in ... Keywords: Hue-Saturation-Intensity-Histogram, Image Segmentation, Malaria Parasites, Microscopic Image Analysis, ROI

Anant R. Koppar; Venugopalachar Sridhar

2011-04-01T23:59:59.000Z

198

Dynamic microscopic theory of fusion using DC-TDHF  

Science Conference Proceedings (OSTI)

The density-constrained time-dependent Hartree-Fock (DC-TDHF) theory is a fully microscopic approach for calculating heavy-ion interaction potentials and fusion cross sections below and above the fusion barrier. We discuss recent applications of DC-TDHF method to fusion of light and heavy systems.

Umar, A. S.; Oberacker, V. E.; Keser, R.; Maruhn, J. A.; Reinhard, P.-G. [Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235 (United States); RTE University, Science and Arts Faculty, Department of Physics, 53100, Rize (Turkey); Institut fuer Theoretische Physik, Goethe-Universitaet, D-60438 Frankfurt am Main (Germany); Institut fur Theoretische Physik, Universitat Erlangen, D-91054 Erlangen (Germany)

2012-10-20T23:59:59.000Z

199

Microscopic Calculation of Fusion: Light to Heavy Systems  

E-Print Network (OSTI)

The density-constrained time-dependent Hartree-Fock (DC-TDHF) theory is a fully microscopic approach for calculating heavy-ion interaction potentials and fusion cross sections below and above the fusion barrier. We discuss recent applications of DC-TDHF method to fusion of light and heavy neutron-rich systems.

A. S. Umar; V. E. Oberacker; J. A. Maruhn; R. Keser

2013-10-02T23:59:59.000Z

200

Spectro-Microscopic Measurements of Carbonaceous Aerosol Aging in Central California  

Science Conference Proceedings (OSTI)

Carbonaceous aerosols are responsible for large uncertainties in climate models, degraded visibility, and adverse health effects. The Carbonaceous Aerosols and Radiative Effects Study (CARES) was designed to study carbonaceous aerosols in the natural environment of Central Valley, California, and learn more about their atmospheric formation and aging. This paper presents results from spectro-microscopic measurements of carbonaceous particles collected during CARES at the time of pollution accumulation event (June 27-29, 2010), when in situ measurements indicated an increase in the organic carbon content of aerosols as the Sacramento urban plume aged. Computer controlled scanning electron microscopy coupled with an energy dispersive X-ray detector (CCSEM/EDX) and scanning transmission X-ray microscopy coupled with near edge X-ray absorption spectroscopy (STXM/NEXAFS) were used to probe the chemical composition and morphology of individual particles. It was found that the mass of organic carbon on individual particles increased through condensation of secondary organic aerosol. STXM/NEXAFS indicated that the number fraction of homogenous organic particles lacking inorganic inclusions (greater than ~50 nm diameter) increased with plume age as did the organic mass per particle. Comparison of the CARES spectro-microscopic data set with a similar dataset obtained in Mexico City during the MILAGRO campaign showed that individual particles in Mexico City contained twice as much carbon as those sampled during CARES. The number fraction of soot particles at the Mexico City urban site (30%) was larger than at the CARES urban site (10%) and the most aged samples from CARES contained less carbon-carbon double bonds. Differences between carbonaceous particles in Mexico City and California result from different sources, photochemical conditions, gas phase reactants, and secondary organic aerosol precursors. The detailed results provided by these spectro-microscopic measurements will allow for a comprehensive evaluation of aerosol process models used in climate research.

Moffet, Ryan C.; Rodel, Tobias; Kelly, Stephen T.; Yu, Xiao-Ying; Carroll, Gregory; Fast, Jerome D.; Zaveri, Rahul A.; Laskin, Alexander; Gilles, Mary K.

2013-10-29T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


201

Real-Time and Post-Reaction Microscopic Structural Analysis of Biomass Undergoing Pyrolysis  

Science Conference Proceedings (OSTI)

The structural complexity of unprocessed plant tissues used for thermochemical conversion of biomass to fuels and energy impedes heat and mass transfer and may increase the occurrence of tar-forming secondary chemical reactions. At industrial scales, gas and liquid products trapped within large biomass particles may reduce net fuel yields and increase tars, impacting industrial operations and increasing overall costs. Real-time microscopic analysis of poplar (Populus sp.) wood samples undergoing anoxic, pyrolytic heat treatment has revealed a pattern of tissue and macropore expansion and collapse. Post-reaction structural analyses of biomass char (biochar) by light and transmission electron microscopy have provided direct structural evidence of pyrolysis product mass-transfer issues, including trapped pyrolysis products and cell wall compression, and have demonstrated the impact of heat-transfer problems on biomass particles. Finally, microscopic imaging has revealed that pyrolyzed/gasified biochars recovered from a fluidized bed reactor retain a similar pre-reaction basic plant tissue structure as the samples used in this study, suggesting that the phenomena observed here are representative of those that occur in larger scale reactors.

Haas, T. J.; Nimlos, M. R.; Donohoe, B. S.

2009-01-01T23:59:59.000Z

202

Electron Microprobe  

Science Conference Proceedings (OSTI)

Electron Microprobe. ... The JEOL JXA-8600 is a conventional hairpin filament thermal emission electron microprobe that is more than 20 years old. ...

2012-10-01T23:59:59.000Z

203

Development of a nanostructure thermal property measurement platform compatible with a transmission electron microscope  

E-Print Network (OSTI)

Measurements of the electrical and thermal transport properties of one-dimensional nanostructures (e.g., nanotubes and nanowires) typically are obtained without detailed knowledge of the specimen's atomicscale structure ...

Harris, C. Thomas (Charles Thomas)

2010-01-01T23:59:59.000Z

204

The In situ Compression of Annealed Molybdenum Nanopillars in the Transmission Electron Microscope  

E-Print Network (OSTI)

funded by the U.S. Department of Energy, Office of Science,Office of Basic Energy Sciences. The author also

Lowry, Matthew

2011-01-01T23:59:59.000Z

205

The In situ Compression of Annealed Molybdenum Nanopillars in the Transmission Electron Microscope  

E-Print Network (OSTI)

the auspices of the US Department of Energy by Lawrencesupported by the US Department of Energy under Contract #DE-an Energy Frontier Research Center funded by the U.S.

Lowry, Matthew

2011-01-01T23:59:59.000Z

206

The In situ Compression of Annealed Molybdenum Nanopillars in the Transmission Electron Microscope  

E-Print Network (OSTI)

10.1021/nl201890s (2011). Herring, C. & Galt, J. K. Elasticthe 1950?s by Galt and Herring 14 , Brenner 15 , and others,

Lowry, Matthew

2011-01-01T23:59:59.000Z

207

Robust Alignment of Transmission Electron Microscope Tilt Series Sami S. Brandt  

E-Print Network (OSTI)

Processing Laboratory, Dept. of Electrcal and Information Engineering, P.O. Box 4500, FI-90014 University

Brandt, Sami

208

In-Situ Transmission Electron Microscopic Study of the E-Beam ...  

Science Conference Proceedings (OSTI)

Under e-beam irradiation, the structural ordering parallel to the basal plane gradually deteriorated because of the appearance of dislocation loops, bending and ...

209

Characterization of electron microscopes with binary pseudo-random multilayer test samples  

E-Print Network (OSTI)

CA 94720, USA NSLS-II, Brookhaven National Laboratory,Berkeley, CA 94720, USA Brookhaven National Laboratory,Laboratory. Research at Brookhaven National Laboratory is

Yashchuk, Valeriy V

2010-01-01T23:59:59.000Z

210

Characterization of electron microscopes with binary pseudo-random multilayer test samples  

E-Print Network (OSTI)

94720, USA b NSLS-II, Brookhaven National Laboratory, Upton,Berkeley, CA 94720, USA Brookhaven National Laboratory,Laboratory. Research at Brookhaven National Laboratory is

Yashchuk, Valeriy V

2010-01-01T23:59:59.000Z

211

materials analysis of inorganic, organic, and bioma-terials. See ELECTRON MICROSCOPE.  

E-Print Network (OSTI)

plaster is also used in the industry to designate plaster of paris. Plaster is usually applied in one). The finish coat consists of hydrated lime and gypsum plaster (in addition to the water). See LIME (INDUSTRY method of ceramic forming see CERAMICS. When the powdered hemihydrate is mixed with water to form a paste

Anderson, Peter M.

212

Transmission-mode imaging in the environmental scanning electron microscope (ESEM)  

E-Print Network (OSTI)

and negate any charging artefacts that would otherwise be caused. The first published use of the ESEM was on wool fibres [6], when Dani- latos also demonstrated the ability of the instrument to work at atmospheric pressures. Due to various technical...

Staniewicz, Lech Thomas Leif

2012-02-07T23:59:59.000Z

213

A NEW FAILURE MECHANISM BY SCANNING ELECTRON MICROSCOPE INDUCED ELECTRICAL BREAKDOWN OF TUNGSTEN WINDOWS IN  

E-Print Network (OSTI)

WINDOWS IN INTEGRATED CIRCUIT PROCESSING BY DAVID M. SHUTTLEWORTH A THESIS PRESENTED TO THE GRADUATE.............................................................................10 2.1.2 Mechanics of the Window Liner.4. THE PROCEDURE - EXPERIMENT ONE:WINDOW-1........ERROR! BOOKMARK NOT DEFINED. 3.5. THE PROCEDURE: EXPERIMENT 2

Pearton, Stephen J.

214

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope  

SciTech Connect

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p {<=}10{sup -10} mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter [Department of Physics, McGill University, 3600 Rue University, Montreal, QC H3A2T8 (Canada)

2011-11-15T23:59:59.000Z

215

Underwater microscope for measuring spatial and temporal changes in bed-sediment grain size  

E-Print Network (OSTI)

Underwater microscope for measuring spatial and temporal changes in bed-sediment grain size David M by Elsevier B.V. Keywords: Underwater microscope; Bed sediment; Grain size; In situ measurement; Colorado counts on a small subset of processed images. 2.3. Underwater microscope hardware Digital images of bed

216

Ion-induced electron emission microscopy  

DOE Patents (OSTI)

An ion beam analysis system that creates multidimensional maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the secondary electrons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted secondary electrons are collected in a strong electric field perpendicular to the sample surface and (optionally) projected and refocused by the electron lenses found in a photon emission electron microscope, amplified by microchannel plates and then their exact position is sensed by a very sensitive X Y position detector. Position signals from this secondary electron detector are then correlated in time with nuclear, atomic or electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these secondary electrons in the fit place.

Doyle, Barney L. (Albuquerque, NM); Vizkelethy, Gyorgy (Albuquerque, NM); Weller, Robert A. (Brentwood, TN)

2001-01-01T23:59:59.000Z

217

Extracting physically interpretable data from electron energy-loss spectra.  

SciTech Connect

Principal component analysis is routinely applied to analyze data sets in electron energy-loss spectroscopy (EELS). We show how physically meaningful spectra can be obtained from the principal components using a knowledge of the scattering of the probe electron and the geometry of the experiment. This approach is illustrated by application to EELS data for the carbon K edge in graphite obtained using a conventional transmission electron microscope. The effect of scattering of the probe electron is accounted for, yielding spectra which are equivalent to experiments using linearly polarized X-rays. The approach is general and can also be applied to EELS in the context of scanning transmission electron microscopy.

Witte, C.; Zaluzec, N. J.; Allen, L. J.; Materials Science Division; Univ. of Melbourn

2010-10-30T23:59:59.000Z

218

Berkeley Lab A to Z Index: T  

NLE Websites -- All DOE Office Websites (Extended Search)

Table of Isotopes Table of Isotopes Table of Isotopes: Exploring Taleo Tax Services Technology Transfer Opportunities and Approaches at the Lab Telecommuting Telemetry Database Telephone Service Center: Audio/Web Conferencing, Cellular, Rates, etc. Telephone Services: How To Request Telephone Service and Equipment Termination Termination Process Guide Termination Notification System (TNS) TeX, LaTeX Information Thermostats and Comfort Controls Time Reporting Today at Berkeley Lab To Know Ourselves: The U.S. Department of Energy and the Human Genome Project Total Rewards at Berkeley Lab Tours: Joint Genome Institution Educational Tours of Berkeley Lab for the Public Traffic Safety Training (EH&S) Training (OCFO) Training Resources Transit Passes TEAM (Transmission Electron Aberration-Corrected Microscope)

219

Electron Transfer  

NLE Websites -- All DOE Office Websites (Extended Search)

3 3 Pierre Kennepohl1,2 and Edward Solomon1* 1Department of Chemistry, Stanford University, Stanford, CA 94305 Electron transfer, or the act of moving an electron from one place to another, is amongst the simplest of chemical processes, yet certainly one of the most critical. The process of efficiently and controllably moving electrons around is one of the primary regulation mechanisms in biology. Without stringent control of electrons in living organisms, life could simply not exist. For example, photosynthesis and nitrogen fixation (to name but two of the most well-known biochemical activities) are driven by electron transfer processes. It is unsurprising, therefore, that much effort has been placed on understanding the fundamental principles that control and define the simple act of adding and/or removing electrons from chemical species.

220

Application: Electronics  

Science Conference Proceedings (OSTI)

Application: Electronics. ... Suppression of Electrical Cable Fires: Development of a Standard PVC Cable Fire Test for ISO 14520-1.. Robin, ML ...

2011-12-22T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


221

Vanishing electronics  

Science Conference Proceedings (OSTI)

Engineers are reinventing electronics by building safe devices that dissolve in the body or within the environment. The technology could redefine everything from medicine to computing.

Samuel Greengard

2013-05-01T23:59:59.000Z

222

Analytical scanning evanescent microwave microscope and control stage  

DOE Patents (OSTI)

A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

2013-01-22T23:59:59.000Z

223

Level densities of nickel isotopes: microscopic theory versus experiment  

E-Print Network (OSTI)

We apply a spin-projection method to calculate microscopically the level densities of a family of nickel isotopes $^{59-64}$Ni using the shell model Monte Carlo approach in the complete $pfg_{9/2}$ shell. Accurate ground-state energies of the odd-mass nickel isotopes, required for the determination of excitation energies, are determined using the Green's function method recently introduced to circumvent the odd particle-number sign problem. Our results are in excellent agreement with recent measurements based on proton evaporation spectra and with level counting data at low excitation energies. We also compare our results with neutron resonance data, assuming equilibration of parity and a spin-cutoff model for the spin distribution at the neutron binding energy, and find good agreement with the exception of $^{63}$Ni.

M. Bonett-Matiz; Abhishek Mukherjee; Y. Alhassid

2013-05-01T23:59:59.000Z

224

A millikelvin scanning tunneling microscope with two independent scanning systems  

E-Print Network (OSTI)

We describe the design, construction and operation of a scanning tunneling microscope (STM) with two tips that can independently acquire simultaneous scans of a sample. The STM is mounted on a dilution refrigerator and the setup includes vibration isolation, rf-filtered wiring, an ultra high vacuum (UHV) sample preparation chamber and sample transfer mechanism. We present images and spectroscopy taken with superconducting Nb tips with the refrigerator at 35 mK that indicate that the effective temperature of our tips/sample is approximately 184 mK, corresponding to an energy resolution of 16 $\\mu$eV. Atomic resolution topographic images of an Au(100) surface taken with the inner and outer tips were found to have root mean square roughness of 1.75 $\\pm$ 0.01 pm and 3.55 $\\pm$ 0.03 pm respectively.

Roychowdhury, A; Anderson, J R; Lobb, C J; Wellstood, F C; Dreyer, M

2013-01-01T23:59:59.000Z

225

Neutron scattering analysis with microscopic optical model potentials  

Science Conference Proceedings (OSTI)

A review of microscopic optical model potentials used in the analysis of neutron scattering and analyzing power data below 100 MeV (5 {le}E{sub n}{le}100 MeV) is presented. The quality of the fits to the data over a wide massd ({sup 6}Li-{sup 239}Pu) and energy range is discussed. It is shown that reasonably good agreement with the data is obtained with only three parameters, {lambda}{sub V}, {lambda}{sub W}, and {lambda}{sub SO}, which show a smooth mass and energy dependence. These parameters are normalizing constants to the real (V), and imaginary (W) central potentials and the real spin-orbit (V{sub SO}) potential. 14 refs., 7 figs.

Hansen, L.F.

1991-09-03T23:59:59.000Z

226

Analytical scanning evanescent microwave microscope and control stage  

DOE Patents (OSTI)

A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

Xiang, Xiao-Dong (Danville, CA); Gao, Chen (Anhui, CN); Duewer, Fred (Albany, CA); Yang, Hai Tao (Albany, CA); Lu, Yalin (Chelmsford, MA)

2009-06-23T23:59:59.000Z

227

Design and performance of an ultra-high vacuum scanning tunneling microscope operating at dilution refrigerator temperatures and high magnetic fields  

E-Print Network (OSTI)

We describe the construction and performance of a scanning tunneling microscope (STM) capable of taking maps of the tunneling density of states with sub-atomic spatial resolution at dilution refrigerator temperatures and high (14 T) magnetic fields. The fully ultra-high vacuum system features visual access to a two-sample microscope stage at the end of a bottom-loading dilution refrigerator, which facilitates the transfer of in situ prepared tips and samples. The two-sample stage enables location of the best area of the sample under study and extends the experiment lifetime. The successful thermal anchoring of the microscope, described in detail, is confirmed through a base temperature reading of 20 mK, along with a measured electron temperature of 250 mK. Atomically-resolved images, along with complementary vibration measurements, are presented to confirm the effectiveness of the vibration isolation scheme in this instrument. Finally, we demonstrate that the microscope is capable of the same level of perform...

Misra, Shashank; Drozdov, Ilya K; Seo, Jungpil; Gyenis, Andras; Kingsley, Simon C J; Jones, Howard; Yazdani, Ali

2013-01-01T23:59:59.000Z

228

Electron Microscopy Study of Tin Whisker Growth  

Science Conference Proceedings (OSTI)

The growth of tin whiskers formed on sputtered tin layers deposited on brass was studied using electron microscopy. The occurrence of whiskers appeared to be largely independent of the macroscopic stress state in the film; rather it was microscopic compressive stresses arising from the formation of an intermetallic phase that appeared to be the necessary precursor. Whisker morphology was a result of whether nucleation had occurred on single grains or on multiple grains. In the latter case, the whiskers had a fluted or striated surface. The formation of whiskers on electron transparent samples was demonstrated. These samples showed the whiskers were monocrystalline and defect free, and that the growth direction could be determined.

Norton, Murray G. (Washington State University); Lebret, Joel (8392)

2003-03-30T23:59:59.000Z

229

Microscopic Study on the Interface Reaction between Ti and Al-Zn ...  

Science Conference Proceedings (OSTI)

Presentation Title, Microscopic Study on the Interface Reaction between Ti and Al -Zn Alloy during Ultra-Fast Heat Treatment. Author(s), Yue Zhao, David Nolan, ...

230

MICROSCOPIC CALCULATIONS OF FISSION BARRIERS AND CRITICAL ANGULAR MOMENTA FOR EXCITED HEAVY NUCLEAR SYSTEMS  

E-Print Network (OSTI)

Physics and Chemistry of Fission, Vienna 1969 (IAEA, ViennaDeformation energies along the fission path plotted againstMICROSCOPIC CALCULATIONS OF FISSION BARRIERS AND CRITICAL

Diebel, Michael

2013-01-01T23:59:59.000Z

231

Microscopic Characterization of Carbonaceous Aerosol Particle Aging in the Outflow from Mexico City  

E-Print Network (OSTI)

Northwest National Laboratory. PNNL is operated by the U.S.Northwest National Laboratory (PNNL). Detailed experimentalelectron microscope at EMSL/PNNL was used for computer

Moffet, R. C.

2010-01-01T23:59:59.000Z

232

Uranium-contaminated soils: Ultramicrotomy and electron beam analysis  

Science Conference Proceedings (OSTI)

Uranium contaminated soils from the Fernald Operation Site, Ohio, have been examined by a combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM). A method is described for preparing of transmission electron microscopy (TEM) thin sections by ultramicrotomy. By using these thin sections, SEM and TEM images can be compared directly. Uranium was found in iron oxides, silicates (soddyite), phosphates (autunites), and fluorite. Little uranium was associated with clays. The distribution of uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Dietz, N.L.; Bates, J.K.; Cunnane, J.C.

1994-04-01T23:59:59.000Z

233

Power Electronics  

Energy.gov (U.S. Department of Energy (DOE))

Power electronics (PE) play a critical role in transforming the current electric grid into the next-generation grid.  PE enable utilities to deliver power to their customers effectively while...

234

Microscopic scattering theory for interacting bosons in weak random potentials  

E-Print Network (OSTI)

We develop a diagrammatic scattering theory for interacting bosons in a three-dimensional, weakly disordered potential. Based on a microscopic N-body scattering theory, we identify the relevant diagrams including elastic and inelastic collision processes that are sufficient to describe diffusive quantum transport. By taking advantage of the statistical properties of the weak disorder potential, we demonstrate how the N-body dynamics can be reduced to a nonlinear integral equation of Boltzmann type for the single-particle diffusive flux. Our theory reduces to the Gross-Pitaevskii mean field description in the limit where only elastic collisions are taken into account. However, even at weak interaction strength, inelastic collisions lead to energy redistribution between the bosons - initially prepared all at the same single-particle energy - and thereby induce thermalization of the single-particle current. In addition, we include also weak localization effects and determine the coherent corrections to the incoherent transport in terms of the coherent backscattering signal. We find that inelastic collisions lead to an enhancement of the backscattered cone in a narrow spectral window for increasing interaction strength.

Tobias Geiger; Andreas Buchleitner; Thomas Wellens

2013-07-18T23:59:59.000Z

235

Towards a Microscopic Reaction Description Based on Energy Density Functionals  

SciTech Connect

A microscopic calculation of reaction cross sections for nucleon-nucleus scattering has been performed by explicitly coupling the elastic channel to all particle-hole excitations in the target and one-nucleon pickup channels. The particle-hole states may be regarded as doorway states through which the flux flows to more complicated configurations, and subsequently to long-lived compound nucleus resonances. Target excitations for {sup 40,48}Ca, {sup 58}Ni, {sup 90}Zr and {sup 144}Sm were described in a random-phase framework using a Skyrme functional. Reaction cross sections obtained agree very well with experimental data and predictions of a state-of-the-art fitted optical potential. Couplings between inelastic states were found to be negligible, while the pickup channels contribute significantly. The effect of resonances from higher-order channels was assessed. Elastic angular distributions were also calculated within the same method, achieving good agreement with experimental data. For the first time observed absorptions are completely accounted for by explicit channel coupling, for incident energies between 10 and 70 MeV, with consistent angular distribution results.

Nobre, G A; DIetrich, F S; Escher, J E; Thompson, I J; Dupuis, M; Terasaki, J; Engel, J

2011-09-26T23:59:59.000Z

236

Microscopic track structure of equal-LET heavy ions  

SciTech Connect

The spatial distributions of ionization and energy deposition produced by heavy (HZE) ions are crucial to an understanding of their radiation quality as exhibited eg., in track segment experiments of cell survival and chromosome aberrations of mammalian cells. The stopping power (or LET) of a high velocity ion is proportional to the ratio Z**2/v**2, apart from a slowly varying logarithmic factor. The maximum delta-ray energy that an ion can produce is proportional to v**2 (non-relativistically). Therefore, two HZE ions having the same LET, but in general differing Z and v will have different maximum delta-ray energies and consequently will produce different spatial patterns of energy deposition along their paths. To begin to explore the implications of this fact for the microscopic dosimetry of heavy ions, we have calculated radial distributions in energy imparted and ionization for iron and neon ions of approximately equal LET in order to make a direct comparison of their delta-ray track structure. Monte Carlo techniques are used for the charged particle radiation transport simulation. 10 refs., 8 figs.

Wilson, W.E.; Criswell, T.L.

1986-07-01T23:59:59.000Z

237

The Microscopic Approach to Nuclear Matter and Neutron Star Matter  

E-Print Network (OSTI)

We review a variety of theoretical and experimental investigations aimed at improving our knowledge of the nuclear matter equation of state. Of particular interest are nuclear matter extreme states in terms of density and/or isospin asymmetry. The equation of state of matter with unequal concentrations of protons and neutrons has numerous applications. These include heavy-ion collisions, the physics of rare, short-lived nuclei and, on a dramatically different scale, the physics of neutron stars. The "common denominator" among these (seemingly) very different systems is the symmetry energy, which plays a crucial role in both the formation of the neutron skin in neutron-rich nuclei and the radius of a neutron star (a system 18 orders of magnitude larger and 55 orders of magnitude heavier). The details of the density dependence of the symmetry energy are not yet sufficiently constrained. Throughout this article, our emphasis will be on the importance of adopting a microscopic approach to the many-body problem, which we believe to be the one with true predictive power.

Francesca Sammarruca

2010-01-31T23:59:59.000Z

238

Use of single scatter electron monte carlo transport for medical radiation sciences  

DOE Patents (OSTI)

The single scatter Monte Carlo code CREEP models precise microscopic interactions of electrons with matter to enhance physical understanding of radiation sciences. It is designed to simulate electrons in any medium, including materials important for biological studies. It simulates each interaction individually by sampling from a library which contains accurate information over a broad range of energies.

Svatos, Michelle M. (Oakland, CA)

2001-01-01T23:59:59.000Z

239

Particle Formation from Pulsed Laser Irradiation of SootAggregates studied with scanning mobility particle sizer, transmissionelectron microscope and near-edge x-ray absorption fine structure.  

Science Conference Proceedings (OSTI)

We investigated the physical and chemical changes induced in soot aggregates exposed to laser radiation using a scanning mobility particle sizer, a transmission electron microscope, and a scanning transmission x-ray microscope to perform near-edge x-ray absorption fine structure spectroscopy. Laser-induced nanoparticle production was observed at fluences above 0.12 J/cm(2) at 532 nm and 0.22 J/cm(2) at 1064 nm. Our results indicate that new particle formation proceeds via (1) vaporization of small carbon clusters by thermal or photolytic mechanisms, followed by homogeneous nucleation, (2) heterogeneous nucleation of vaporized carbon clusters onto material ablated from primary particles, or (3) both processes.

Michelsen, Hope A.; Tivanski, Alexei V.; Gilles, Mary K.; vanPoppel, Laura H.; Dansson, Mark A.; Buseck, Peter R.; Buseck, Peter R.

2007-02-20T23:59:59.000Z

240

Biological applications of an LCoS-BASED PROGRAMMABLE ARRAY MICROSCOPE (PAM)  

E-Print Network (OSTI)

fluorescence microscope (PAM) for rapid, light efficient 3D imaging of living specimens. The stand-alone module fluorescence microscope. The prototype system currently operated at the Max Planck Institute incorporates a 6-position high-intensity LED illuminator, modulated laser and lamp light sources, and an Andor iXon em

Rieger, Bernd

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


241

Electron tube  

DOE Patents (OSTI)

An electron tube of the present invention includes: a vacuum vessel including a face plate portion made of synthetic silica and having a surface on which a photoelectric surface is provided, a stem portion arranged facing the photoelectric surface and made of synthetic silica, and a side tube portion having one end connected to the face plate portion and the other end connected to the stem portion and made of synthetic silica; a projection portion arranged in the vacuum vessel, extending from the stem portion toward the photoelectric surface, and made of synthetic silica; and an electron detector arranged on the projection portion, for detecting electrons from the photoelectric surface, and made of silicon.

Suyama, Motohiro (Hamamatsu, JP); Fukasawa, Atsuhito (Hamamatsu, JP); Arisaka, Katsushi (Los Angeles, CA); Wang, Hanguo (North Hills, CA)

2011-12-20T23:59:59.000Z

242

Glossary Item - Electron  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron An Electron Electrons are negatively charged particles that surround the atom's nucleus. Electrons were discovered by J. J. Thomson in 1897. Particle Data Symbol Mass...

243

The theory and practice of high resolution scanning electron microscopy  

Science Conference Proceedings (OSTI)

Recent advances in instrumentation have produced the first commercial examples of what can justifiably be called High Resolution Scanning Electron Microscopes. The key components of such instruments are a cold field emission gun, a small-gap immersion probe-forming lens, and a clean dry-pumped vacuum. The performance of these microscopes is characterized by several major features including a spatial resolution, in secondary electron mode on solid specimens, which can exceed 1nm on a routine basis; an incident probe current density of the order of 10{sup 6} amps/cm{sup 2}; and the ability to maintain these levels of performance over an accelerating voltage range of from 1 to 30keV. This combination of high resolution, high probe current, low contamination and flexible electron-optical conditions provides many new opportunitites for the application of the SEM to materials science, physics, and the life sciences. 27 refs., 14 figs.

Joy, D.C. (Tennessee Univ., Knoxville, TN (USA) Oak Ridge National Lab., TN (USA))

1990-01-01T23:59:59.000Z

244

Radiation microscope for SEE testing using GeV ions.  

SciTech Connect

Radiation Effects Microscopy is an extremely useful technique in failure analysis of electronic parts used in radiation environment. It also provides much needed support for development of radiation hard components used in spacecraft and nuclear weapons. As the IC manufacturing technology progresses, more and more overlayers are used; therefore, the sensitive region of the part is getting farther and farther from the surface. The thickness of these overlayers is so large today that the traditional microbeams, which are used for REM are unable to reach the sensitive regions. As a result, higher ion beam energies have to be used (> GeV), which are available only at cyclotrons. Since it is extremely complicated to focus these GeV ion beams, a new method has to be developed to perform REM at cyclotrons. We developed a new technique, Ion Photon Emission Microscopy, where instead of focusing the ion beam we use secondary photons emitted from a fluorescence layer on top of the devices being tested to determine the position of the ion hit. By recording this position information in coincidence with an SEE signal we will be able to indentify radiation sensitive regions of modern electronic parts, which will increase the efficiency of radiation hard circuits.

Doyle, Barney Lee; Knapp, James Arthur; Rossi, Paolo; Hattar, Khalid M.; Vizkelethy, Gyorgy; Brice, David Kenneth; Branson, Janelle V.

2009-09-01T23:59:59.000Z

245

ELECTRONIC MULTIPLIER  

DOE Patents (OSTI)

S>An electronic multiplier is described for use in analog computers. Two electrical input signals are received; one controls the slope of a saw-tooth voltage wave while the other controls the time duration of the wave. A condenser and diode clamps are provided to sustain the crest voltage reached by the wave, and for storing that voltage to provide an output signal which is a steady d-c voltage.

Collier, D.M.; Meeks, L.A.; Palmer, J.P.

1961-01-31T23:59:59.000Z

246

ELECTRON GUN  

DOE Patents (OSTI)

A pulsed electron gun capable of delivering pulses at voltages of the order of 1 mv and currents of the order of 100 amperes is described. The principal novelty resides in a transformer construction which is disposed in the same vacuum housing as the electron source and accelerating electrode structure of the gun to supply the accelerating potential thereto. The transformer is provided by a plurality of magnetic cores disposed in circumferentially spaced relation and having a plurality of primary windings each inductively coupled to a different one of the cores, and a helical secondary winding which is disposed coaxially of the cores and passes therethrough in circumferential succession. Additional novelty resides in the disposition of the electron source cathode filament input leads interiorly of the transformer secondary winding which is hollow, as well as in the employment of a half-wave filament supply which is synchronously operated with the transformer supply such that the transformer is pulsed during the zero current portions of the half-wave cycle.

Christofilos, N.C.; Ehlers, K.W.

1960-04-01T23:59:59.000Z

247

Investigation of proximity effects in electron microscopy and lithography  

SciTech Connect

A fundamental challenge in lithographic and microscopic techniques employing focused electron beams are so-called proximity effects due to unintended electron emission and scattering in the sample. Herein, we apply a method that allows for visualizing electron induced surface modifications on a SiN substrate covered with a thin native oxide layer by means of iron deposits. Conventional wisdom holds that by using thin membranes proximity effects can be effectively reduced. We demonstrate that, contrary to the expectation, these can be indeed larger on a 200 nm SiN-membrane than on the respective bulk substrate due to charging effects.

Walz, M.-M.; Vollnhals, F.; Rietzler, F.; Schirmer, M.; Steinrueck, H.-P.; Marbach, H.

2012-01-30T23:59:59.000Z

248

Geek-Up[6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes |  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes 3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes Geek-Up[6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes June 3, 2011 - 2:04pm Addthis Novartis Diagnostics scientist Cleo Salisbury and Biological Nanostructures Facility director Ron Zuckermann discuss their collaboration to discover new therapies for Alzheimer's. Niketa Kumar Niketa Kumar Public Affairs Specialist, Office of Public Affairs What does this mean for me? Researchers have developed new inorganic nanocrystal arrays created by spraying a new type of colloidal "ink." Scientists have engineered a technique to help doctors identify Alzheimer's in its early stages and discover new therapies for this disease. Scientists have developed a new type of atomic force microscope that

249

Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes  

NLE Websites -- All DOE Office Websites (Extended Search)

and Beamline 11.0.2, it was possible to combine this technique with the scanning transmission x-ray microscope (STXM) to image the spatial distribution of the compounds. Some...

250

Microscopic Analysis of Agriculture Products, 4th EditionChapter 3 Feed Ingredients of Animal Origin  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 3 Feed Ingredients of Animal Origin Methods and Analyses eChapters Methods - Analyses Books Downloadable pdf of Chapter 3 Feed Ingredients of Animal Or

251

Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes  

NLE Websites -- All DOE Office Websites (Extended Search)

5.3.2 and Beamline 11.0.2, it was possible to combine this technique with the scanning transmission x-ray microscope (STXM) to image the spatial distribution of the compounds....

252

A Study on Carbon-Nanotube Local Oxidation Lithography Using an Atomic Force Microscope  

Science Conference Proceedings (OSTI)

In this paper, nanoscale anodic oxidation lithography using an atomic force microscope (AFM) is systematically studied on carbon nanotubes (CNTs). Trends between the produced feature size and the corresponding process parameters, such as applied voltage, ...

K. Kumar; O. Sul; S. Strauf; D. S. Choi; F. Fisher; M. G. Prasad; E. Yang

2011-07-01T23:59:59.000Z

253

Microscopic Analysis of Agriculture Products, 4th EditionChapter 2 Feed Ingredients of Plant Origin  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 2 Feed Ingredients of Plant Origin Methods and Analyses eChapters Methods - Analyses Books Press Downloadable pdf of Chapter 2 Feed Ingredients of

254

Microscopic Analysis of Agriculture Products, 4th EditionChapter 4 Feed Ingredients of Marine Origin  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 4 Feed Ingredients of Marine Origin Methods and Analyses eChapters Methods - Analyses Books Press Downloadable pdf of Chapter 4 Feed Ingredients of

255

Microscopic Analysis of Agriculture Products, 4th EditionChapter 7 Weed Seeds of Agricultural Importance  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 7 Weed Seeds of Agricultural Importance Methods and Analyses eChapters Methods - Analyses Books Press Downloadable pdf of Chapter 7 Weed Seeds of A

256

Microscopic Analysis of Agriculture Products, 4th EditionChapter 8 Minerals of Agricultural Importance  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 8 Minerals of Agricultural Importance Methods and Analyses eChapters Methods - Analyses Books Press Downloadable pdf of Chapter 8 Minerals of Agric

257

The Nature of the Distinctive Microscopic Features in R5(SixGe1-x)4 Magnetic Refrigeration Materials  

Science Conference Proceedings (OSTI)

Magnetic refrigeration is a promising technology that offers a potential for high energy efficiency. The giant magnetocaloric effect of the R{sub 5}(Si{sub x}, Ge{sub 1-x}){sub 4} alloys (where R=rare-earth and O {le} x {le} 1), which was discovered in 1997, make them perfect candidates for magnetic refrigeration applications. In this study the microstructures of Gd{sub 5}(Si{sub x}Ge{sub 1-x}){sub 4} alloys have been characterized using electron microscopy techniques, with the focus being on distinctive linear features first examined in 1999. These linear features have been observed in R{sub 5}(Si{sub x}, Ge{sub 1-x}){sub 4} alloys prepared from different rare-earths (Gd, Tb, Dy and Er) with different crystal structures (Gd{sub 5}Si{sub 4}-type orthorhombic, monoclinic and Gd{sub 5}Ge{sub 4}-type orthorhombic). Systematic scanning electron microscope studies revealed that these linear features are actually thin-plates, which grow along specific directions in the matrix material. The crystal structure of the thin-plates has been determined as hexagonal with lattice parameters a=b=8.53 {angstrom} and c=6.40 {angstrom} using selected area diffraction (SAD). Energy dispersive spectroscopy analysis, carried out in both scanning and transmission electron microscopes, showed that the features have a composition approximating to R{sub 5}(Si{sub x},Ge{sub 1-x}){sub 3}.phase. Orientation relationship between the matrix and the thin-plates has been calculated as [- 1010](1-211){sub p}//[010](10-2){sub m}. The growth direction of the thin plates are calculated as (22 0 19) and (-22 0 19) by applying the Ag approach of Zhang and Purdy to the SAD patterns of this system. High Resolution TEM images of the Gd{sub 5}Ge{sub 4} were used to study the crystallographic relationship. A terrace-ledge structure was observed at the interface and a 7{sup o} rotation of the reciprocal lattices with respect to each other, consistent with the determined orientation relationship, was noted. Both observations are consistent with the stated hypothesis that the growth direction of the thin-plates is parallel to an invariant line direction. Based on the terrace-ledge structure of the thin-plate interface a displacive-diffusional growth mechanism has been proposed to explain the rapid formation of the R{sub 5}(Si{sub x},Ge{sub 1-x}){sub 3} plates.

Ozan Ugurlu

2006-05-01T23:59:59.000Z

258

Physics Out Loud - Electrons  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Scattering Previous Video (Electron Scattering) Physics Out Loud Main Index Next Video (Elementary Particles) Elementary Particles Electrons David Lawrence, a physicist,...

259

Three-dimensional fabrication and characterisation of core-shell nano-columns using electron beam patterning of Ge-doped SiO{sub 2}  

Science Conference Proceedings (OSTI)

A focused electron beam in a scanning transmission electron microscope (STEM) is used to create arrays of core-shell structures in a specimen of amorphous SiO{sub 2} doped with Ge. The same electron microscope is then used to measure the changes that occurred in the specimen in three dimensions using electron tomography. The results show that transformations in insulators that have been subjected to intense irradiation using charged particles can be studied directly in three dimensions. The fabricated structures include core-shell nano-columns, sputtered regions, voids, and clusters.

Gontard, Lionel C. [Instituto de Ciencia de Materiales de Sevilla (CSIC), 41092 Sevilla (Spain); Jinschek, Joerg R. [FEI Europe, Achtseweg Noord 5, 5600 KA Eindhoven (Netherlands); Ou Haiyan [Department of Photonics, Technical University of Denmark, DK-2800 Kongens Lyngby (Denmark); Verbeeck, Jo [EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp (Belgium); Dunin-Borkowski, Rafal E. [Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Gruenberg Institute, Forschungszentrum Juelich, D-52425 Juelich (Germany)

2012-06-25T23:59:59.000Z

260

Vacuum-tight sample transfer stage for a scanning electron microscopic study of stabilized lithium metal particles  

Science Conference Proceedings (OSTI)

To facilitate construction analysis, failure analysis, and research in lithium ion battery technology, a high quality methodology for battery disassembly is needed. This paper presents a methodology for battery disassembly that considers key factors based on the nature and purpose of post-disassembly analysis. The methodology involves upfront consideration of analysis paths that will be conducted on the exposed internal components to preserve the state (operational or failed) of the battery. The disassembly processes and exposures must not alter the battery materials once they are removed from their hermetically sealed containers. Because the process of battery disassembly can involve exposure to potentially hazardous compounds or lead to thermal run-away, a brief review concerning the safety hazards of disassembly is also given.

Howe, Jane Y [ORNL; Boatner, Lynn A [ORNL; Kolopus, James A [ORNL; Walker, Larry R [ORNL; Liang, Chengdu [ORNL; Dudney, Nancy J [ORNL; Schaich, Charles Ross [ORNL

2012-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
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261

ELECTRON PARAMAGNETIC RESONANCE ...  

Science Conference Proceedings (OSTI)

ELECTRON PARAMAGNETIC RESONANCE SPECTROELECTROCHEMISTRY OF TRANSITION METAL SOLAR FUELS CATALYSTS. ...

262

Future Electronics in CNST  

Science Conference Proceedings (OSTI)

... Electronic Transport in Nanoscale Organic/Inorganic Devices. ... for graphene, nanophotonic, nanoplasmonic, spintronic, and other future electronics. ...

2013-05-02T23:59:59.000Z

263

High Speed Electronics  

Science Conference Proceedings (OSTI)

High Speed Electronics. ... optic sampling system provides traceability for our electrical waveform measurements ... Metrology for Electronic Packaging. ...

2013-03-25T23:59:59.000Z

264

New thin materials for electronics.  

Science Conference Proceedings (OSTI)

The work described in this report is from an Early Career LDRD to develop and investigate novel thin film organic conductors with drastically improved electronic properties over the current state of the art. In collaboration with the Molecular Foundry at Lawrence Berkeley National Laboratory a Langmuir-Blodgett trough (LB) was built from scavenged parts and added to a scanning Raman microscope at LBNL. First order thin peptoid film samples were fabricated for testing Raman and photoluminescence imagining techniques. Tests showed that a single peptoid sheet can be successfully imaged using confocal Raman spectroscopy and a peptoid sheet can be successfully imaged using near-field photoluminescence at a resolution less than 70 nm. These results have helped position Sandia for advances in this area of MOF film creation. In collaboration with the Molecular Foundry at Lawrence Berkeley National Laboratory, a Langmuir-Blodgett trough (LB) was built and added to a scanning Raman microscope at LBNL. Thin peptoid film samples were fabricated for testing Raman and photoluminescence imagining techniques. Tests showed that a single peptoid sheet can be successfully imaged using confocal Raman spectroscopy, and a peptoid sheet can be successfully imaged using near-field photoluminescence at a resolution less than 70 nm. These results have positioned Sandia for advance in this area of MOF film creation. The interactions with LBNL also led to award of two user projects at the Molecular Foundry at LBNL led by current Sandia staff and the appointment of a current Sandia staff to the Molecular Foundry User Executive Committee.

Schwartzberg, Adam

2012-02-01T23:59:59.000Z

265

X-ray imaging with grazing-incidence microscopes developed for the LIL program  

SciTech Connect

This article describes x-ray imaging with grazing-incidence microscopes, developed for the experimental program carried out on the Ligne d'Integration Laser (LIL) facility [J. P. Le Breton et al., Inertial Fusion Sciences and Applications 2001 (Elsevier, Paris, 2002), pp. 856-862] (24 kJ, UV--0.35 nm). The design includes a large target-to-microscope (400-700 mm) distance required by the x-ray ablation issues anticipated on the Laser MegaJoule facility [P. A. Holstein et al., Laser Part. Beams 17, 403 (1999)] (1.8 MJ) which is under construction. Two eight-image Kirkpatrick-Baez microscopes [P. Kirkpatrick and A. V. Baez J. Opt. Soc. Am. 38, 766 (1948)] with different spectral wavelength ranges and with a 400 mm source-to-mirror distance image the target on a custom-built framing camera (time resolution of {approx}80 ps). The soft x-ray version microscope is sensitive below 1 keV and its spatial resolution is better than 30 {mu}m over a 2-mm-diam region. The hard x-ray version microscope has a 10 {mu}m resolution over an 800-{mu}m-diam region and is sensitive in the 1-5 keV energy range. Two other x-ray microscopes based on an association of toroidal/spherical surfaces (T/S microscopes) produce an image on a streak camera with a spatial resolution better than 30 {mu}m over a 3 mm field of view in the direction of the camera slit. Both microscopes have been designed to have, respectively, a maximum sensitivity in the 0.1-1 and 1-5 keV energy range. We present the original design of these four microscopes and their test on a dc x-ray tube in the laboratory. The diagnostics were successfully used on LIL first experiments early in 2005. Results of soft x-ray imaging of a radiative jet during conical shaped laser interaction are shown.

Rosch, R.; Boutin, J. Y.; Le Breton, J. P.; Gontier, D.; Jadaud, J. P.; Reverdin, C.; Soullie, G.; Lidove, G.; Maroni, R. [CEA/DIF, BP 12, 91680 Bruyeres-Le-Chatel (France)

2007-03-15T23:59:59.000Z

266

NCEM National Center for Electron Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

NCEM Staff Becoming an NCEM User Assistance and Collaboration Visiting Scientist Program Contact Information Manage Proposals Microscope Scheduling Microscopes and Facilities...

267

The effect of zirconium implantation on the structure of sapphire  

Science Conference Proceedings (OSTI)

The effect of zirconium implantation on the structure of sapphire was investigated by 175 keV Zr implantation at room temperature to a fluence of 4 1016 ions/cm2 into sapphire single crystals. Samples were examined by several experimental techniques: Rutherford backscattering spectroscopy along a channeling direction (RBS-C), electron-energy loss spectroscopy (EELS), and Z-contrast images obtained in an aberration-corrected scanning transmission electron microscope. Range and deposited energy were simulated with SRIM-2008.04. The Z-contrast images from transmission electron microscope indicated: a near surface damaged layer ~30 nm thick, a subsurface region exhibiting "random" de-channeling ~52 nm thick, and a deeper damaged, crystalline zone ~64 nm thick. The RBS-C spectra confirmed the presence of these three regions. The two damaged regions contained high concentrations of as yet unresolved defect clusters. The intermediate region contained Zr-clusters embedded in an "amorphous" matrix that exhibited short-range order corresponding to -Al2O3, i.e., a defective spinel structure. The EELS measurements show that the amorphous region is deficient in oxygen.

Sina, Younes [University of Tennessee, Knoxville (UTK); McHargue, Carl J [University of Tennessee, Knoxville (UTK); Duscher, Gerd [University of Tennessee, Knoxville (UTK); Zhang, Yanwen [ORNL

2012-01-01T23:59:59.000Z

268

COMBINED FLUORESCENT AND GOLD PROBES FOR MICROSCOPIC AND MORPHOLOGICAL INVESTIGATIONS.  

SciTech Connect

Nanogold{reg_sign}, a gold cluster with a core of gold atoms 1.4 nm in diameter, has proven to be a superior probe label for electron microscopy (EM), giving both higher labeling density and improved access to previously hindered or restricted antigens. It may be visualized by autometallography (AMG) for use in light microscopy (LM): silver-and gold-amplified Nanogold detection has proven to be one of the most sensitive methods available for the detection of low copy number targets such as viral DNA in cells and tissue specimens. AMG enhancement has also made Nanogold an effective detection label in blots and gels. The following protocols will be described: Labeling of nuclear components in cells. Protocol for in situ hybridization and detection with fluorescein-Nanogold--or Cy3{trademark}-Nanogold-labeled streptavidin. Nanogold is an inert molecule, and generally does not interact with biological molecules unless a specific chemical reactivity is introduced into the molecule. Conjugates are prepared using site-specific chemical conjugation through reactive chemical functionalities introduced during Nanogold preparation, which allows the gold label to be attached to a specific site on the conjugate biomolecule. For example, a maleimido-Nanogold derivative, which is specific for thiol binding, is frequently attached to the hinge region of an antibody at a unique thiol site generated by selective reduction of a hinge disulfide. This site is remote from the antigen combining region, and the Nanogold, therefore, does not compromise target binding. Nanogold may also be prepared with specific reactivity towards amines or other unique chemical groups. This mode of attachment enables the preparation of probes labeled with both Nanogold and fluorescent labels. Different chemical reactivities are used to attach the Nanogold and the fluorescent groups to different sites in the conjugate biomolecule, as shown in Figure 7.1. In this manner, the two labels are spaced sufficiently far apart that fluorescent resonance energy transfer does not quench the fluorescent signal, and the probes may be used to label specimens for fluorescent and EM observation in a single staining procedure. This reduces the complexity of the staining procedure, allowing less specimen perturbation, and also enables a higher degree of correlation between the fluorescence and EM localization of the target, thus increasing the usefulness of the complementary data sets. Since gold and fluorescent-labeled probes are often used at different concentrations under different conditions, optimum procedures for the use of fluorescent and gold probes may entail some degree of compromise between the most appropriate conditions for the two types of probes. However, the chemical stability of the Nanogold label means that it is generally stable to a wide range of use conditions, and the following protocols have been found to be effective for labeling specimens with combined fluorescein and Nanogold-labeled antibody Fab' probes and with combined Cy3 and Nanogold-labeled streptavidin.

POWELL,R.D.HAINFELD,J.F.

2002-04-17T23:59:59.000Z

269

Microscopic Calculation of Fission Fragment Energies for the 239Pu(nth,f) Reaction  

SciTech Connect

We calculate the total kinetic and excitation energies of fragments produced in the thermal-induced fission of {sup 239}Pu. This result is a proof-of-principle demonstration for a microscopic approach to the calculation of fission-fragment observables for applied data needs. In addition, the calculations highlight the application of a fully quantum mechanical description of scission, and the importance of exploring scission configurations as a function of the moments of the fragments, rather than through global constraints on the moments of the fissioning nucleus. Using a static microscopic calculation of configurations at and near scission, we have identified fission fragments for the {sup 239}Pu (n{sub th}, f) reaction and extracted their total kinetic and excitation energies. Comparison with data shows very good overall agreement between theory and experiment. Beyond their success as a proof of principle, these calculations also highlight the importance of local constraints on the fragments themselves in microscopic calculations.

Younes, W; Gogny, D

2011-10-03T23:59:59.000Z

270

Ellipsoidal and parabolic glass capillaries as condensers for x-ray microscopes  

Science Conference Proceedings (OSTI)

Single-bounce ellipsoidal and paraboloidal glass capillary focusing optics have been fabricated for use as condenser lenses for both synchrotron and tabletop x-ray microscopes in the x-ray energy range of 2.5-18 keV. The condenser numerical apertures (NAs) of these devices are designed to match the NA of x-ray zone plate objectives, which gives them a great advantage over zone plate condensers in laboratory microscopes. The fabricated condensers have slope errors as low as 20 {mu}rad rms. These capillaries provide a uniform hollow-cone illumination with almost full focusing efficiency, which is much higher than what is available with zone plate condensers. Sub-50 nm resolution at 8 keV x-ray energy was achieved by utilizing this high-efficiency condenser in a laboratory microscope based on a rotating anode generator.

Zeng Xianghui; Duewer, Fred; Feser, Michael; Huang, Carson; Lyon, Alan; Tkachuk, Andrei; Yun Wenbing

2008-05-01T23:59:59.000Z

271

Optically pulsed electron accelerator  

DOE Patents (OSTI)

An optically pulsed electron accelerator can be used as an injector for a free electron laser and comprises a pulsed light source, such as a laser, for providing discrete incident light pulses. A photoemissive electron source emits electron bursts having the same duration as the incident light pulses when impinged upon by same. The photoemissive electron source is located on an inside wall of a radiofrequency-powered accelerator cell which accelerates the electron burst emitted by the photoemissive electron source.

Fraser, J.S.; Sheffield, R.L.

1985-05-20T23:59:59.000Z

272

Optically pulsed electron accelerator  

DOE Patents (OSTI)

An optically pulsed electron accelerator can be used as an injector for a free electron laser and comprises a pulsed light source, such as a laser, for providing discrete incident light pulses. A photoemissive electron source emits electron bursts having the same duration as the incident light pulses when impinged upon by same. The photoemissive electron source is located on an inside wall of a radio frequency powered accelerator cell which accelerates the electron burst emitted by the photoemissive electron source.

Fraser, John S. (Los Alamos, NM); Sheffield, Richard L. (Los Alamos, NM)

1987-01-01T23:59:59.000Z

273

The NCEM one-Angstrom microscope project reaches 0.89 Angstrom resolution  

SciTech Connect

Sub-Angstrom transmission electron microscopy to a resolution of 0.89 has been achieved at the National Center for Electron Microscopy and is available to electron microscopists who have a requirement for this level of resolution.

O'Keefe, Michael A.; Wang, Y.C.

2000-02-17T23:59:59.000Z

274

Whole-Cell Sensing for a Harmful Bloom-Forming Microscopic Alga by Measuring Antibody-Antigen Forces  

E-Print Network (OSTI)

Fawley, “Diversity of coccoid algae in shallow lakes duringof small coccoid green algae from Lake Itasca, Minnesota,BLOOM-FORMING MICROSCOPIC ALGA BY MEASURING ANTIBODY–

2006-01-01T23:59:59.000Z

275

Bending of metal-filled carbon nanotube under electron beam irradiation  

Science Conference Proceedings (OSTI)

Electron beam irradiation induced, bending of Iron filled, multiwalled carbon nanotubes is reported. Bending of both the carbon nanotube and the Iron contained within the core was achieved using two approaches with the aid of a high resolution electron microscope (HRTEM). In the first approach, bending of the nanotube structure results in response to the irradiation of a pristine kink defect site, while in the second approach, disordered sites induce bending by focusing the electron beam on the graphite walls. The HRTEM based in situ observations demonstrate the potential for using electron beam irradiation to investigate and manipulate the physical properties of confined nanoscale structures.

Misra, Abha [Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore, Karnataka, 560012 (India)

2012-03-15T23:59:59.000Z

276

OIL IN THE OPEN WATER microscopic plants and animals that form the  

E-Print Network (OSTI)

OIL IN THE OPEN WATER microscopic plants and animals that form the basis of the oceanic food web the surface, corals and other deepwater OIL AND HUMAN USE Wellhead CORALS · Coral surveys · Tissue collections · Transect surveys to detect submerged oil · Oil plume modeling · Sediment sampling AQUATIC VEGETATION

277

The Researches of Microscopic Image Segmentation and Recognition on the Cancer Cells Fallen into Peritoneal Effusion  

Science Conference Proceedings (OSTI)

Abstract: Auto-segmentation of cell is one of the most interesting segmentation problems due to the complex nature of the cell tissues and to the inherent problems of video microscopic image. Objects, which are variant, narrow range of gray levels, non-random ... Keywords: Artificial neural network, computer-aided diagnosis, cell image segmentation, cell image recognition, peritoneal effusion

Hongyuan Wang; Shenggen Zeng; Chengang Yu; Xiaogang Wang; Deshen Xia

2001-06-01T23:59:59.000Z

278

Wolter-like high resolution x-ray imaging microscope for Rayleigh Taylor instabilities studies  

SciTech Connect

In the context of the inertial confinement fusion, experiments have been carried out on the Phebus laser facility to study the Rayleigh-Taylor instabilities (RTIs) at the ablation front. Premodulated brominated plastic targets (25 {mu}m thick) with a modulation wavelength between 12 and 50 {mu}m were accelerated with a temporally shaped soft x-ray pulse emitted from a hohlraum with a maximum radiation temperature of about 115 eV. The RTI growth was measured by face-on radiography using a microscope coupled with an x-ray streak camera, which has spatial and temporal resolutions of about 5 {mu}m and 50 ps, respectively. The acceleration was derived from side-on velocity measurements. The microscope we have developed is a Wolter-like microscope which consists of two toroiedal mirrors. We will present the experimental and theoretical potentialities of this microscope: characterization with an x-ray generator and plasma laser x-ray source (Phebus facility) for two-dimensional (2D) and 1D time-resolved imaging studies. Spatial resolution of about 4 {mu}m was achieved in the 1-5 keV range. The Wolter-like constitutes an interesting device for laser plasma diagnostics and will be very useful in the Laser Megajoules experiments conducted with more powerful lasers.

Troussel, Ph.; Meyer, B.; Reverdin, R.; Angelier, B.; Lidove, G.; Salvatore, P.; Richard, A. [Commissariat a l'Energie Atomique, DAM-Ile de France, BP 12, 91680 Bruyeres-les-Chatel (France); Commissariat a l'Energie Atomique, Saclay 91191 (France); Commissariat a l'Energie Atomique, CESTA, BP2, 33114 Le Barp (France)

2005-06-15T23:59:59.000Z

279

Performance Evaluation of Adaptive Ramp-Metering Algorithms Using Microscopic Traffic Simulation Model  

E-Print Network (OSTI)

Performance Evaluation of Adaptive Ramp-Metering Algorithms Using Microscopic Traffic Simulation metering has undergone significant theoretical developments in recent years. However, the applicability been used in an evaluation study of three well-known adaptive ramp-metering algorithms: ALINEA, BOTTLE

Levinson, David M.

280

Microscopic Analysis of Agriculture Products, 4th EditionChapter 1 Methods of Agricultural Microscopy  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 1 Methods of Agricultural Microscopy Methods and Analyses eChapters Methods - Analyses Books 97C1C49A76ADD9BFEBDE5FF95381F911 Press Downloadable pdf...

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


281

Microscopic Analysis of Agriculture Products, 4th EditionChapter 9 Microchemical Spot Tests  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 9 Microchemical Spot Tests Methods and Analyses eChapters Methods - Analyses Books AOCS 6C2FB81BF33EA47CEF1B98AD0BE2A9CB Press Downloadable pdf...

282

Microscopic Analysis of Agriculture Products, 4th EditionChapter 6 Fertilizer Microscopy  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 6 Fertilizer Microscopy Methods and Analyses eChapters Methods - Analyses Books AOCS 8C45832E2AA310DD11A6FEA4BDB93C6B Press Downloadable pdf...

283

STEM-EELS imaging of complex oxides and interfaces  

Science Conference Proceedings (OSTI)

The success of the correction of spherical aberration in the electron microscope has revolutionized our views of oxides. This is a very important class of materials that poses an exciting promise towards future applications of some of the most intriguing phenomena in condensed matter physics: colossal magnetoresistance, colossal ionic conductivity, high Tc superconductivity, ferroelectricity, etc. Understanding the physics underlying such phenomena, especially in low dimensional systems (thin films, interfaces, nanowires, nanoparticles, etc), relies on the availability of techniques capable of looking at these systems in real space and with atomic resolution and even beyond: in many cases the system properties depend on minuscule amounts of minuscule point defects that alter the materials properties dramatically. Atomic resolution spectroscopy in the aberration corrected electron microscope is one of the most powerful techniques available to materials scientists today. This article will briefly review some state-of-the-art applications of these techniques to oxide materials: from atomic resolution elemental mapping and single atom imaging to applications to real systems including oxide interfaces and mapping of physical properties such as the spin state of magnetic atoms.

Varela del Arco, Maria [ORNL; Gazquez Alabart, Jaume [ORNL; Pennycook, Stephen J [ORNL

2012-01-01T23:59:59.000Z

284

Glossary Term - Electron Capture  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Electron Previous Term (Electron) Glossary Main Index Next Term (Electron Volt (eV)) Electron Volt (eV) Electron Capture After electron capture, an atom contains one less proton and one more neutron. Electron capture is one process that unstable atoms can use to become more stable. During electron capture, an electron in an atom's inner shell is drawn into the nucleus where it combines with a proton, forming a neutron and a neutrino. The neutrino is ejected from the atom's nucleus. Since an atom loses a proton during electron capture, it changes from one element to another. For example, after undergoing electron capture, an atom of carbon (with 6 protons) becomes an atom of boron (with 5 protons). Although the numbers of protons and neutrons in an atom's nucleus change

285

FREE ELECTRON LASERS  

E-Print Network (OSTI)

1984). Colson, W. B. , "Free electron laser theory," Ph.D.M. 0. , Spitzer, R. , editors, Free Electron Generators ofM.D. , Spitzer, R. , editors, Free Electron Generators of

Colson, W.B.

2008-01-01T23:59:59.000Z

286

M. Luysberg, K. Tillmann, T. Weirich (Eds.): EMC 2008, Vol. 1: Instrumentation and Methods, pp. 3738, DOI: 10.1007/978-3-540-85156-1_19, Springer-Verlag Berlin Heidelberg 2008  

E-Print Network (OSTI)

dashed lines. Scale bars: (a) 2 µm, (b) 500 nm. Figure 2. Atomic resolution images of graphene samples and resolving individual adatoms, vacancies, and their dynamics on graphene membranes J.C. Meyer1 , C@jannikmeyer.de Keywords: Graphene, defects, aberration-corrected electron microscopy, single atom detection Graphene

Zettl, Alex

287

Electron-Ion Collisions  

Science Conference Proceedings (OSTI)

... Since the ions are created and excited with the same beam of electrons, by changing the electron beam energy one can selectively exclude certain ...

2010-12-07T23:59:59.000Z

288

Free Electron Laser  

NLE Websites -- All DOE Office Websites (Extended Search)

Free Electron Laser Building Exterior Top Floor Control Room RF Gallery User Lab Beam Enclosure Injector Linear Accelerator Wiggler Magnet Return Line Free Electron Laser Most...

289

Electron Affinity Search  

Science Conference Proceedings (OSTI)

... Electron Affinity Search Help. Search options (step 1) (Back to search). You may search for species based on electron affinity values in two ways: ...

2013-07-15T23:59:59.000Z

290

Diamondoids Improve Electron Emitters  

NLE Websites -- All DOE Office Websites (Extended Search)

Diamondoids Improve Electron Emitters Diamondoids Improve Electron Emitters Print Monday, 17 September 2012 12:02 Diamondoids are nanoparticles made of only a handful of carbon...

291

Single Electron Coherence  

Science Conference Proceedings (OSTI)

... Single electron tunneling (SET) devices have the amazing property that we can measure and control the motion of electrons one-by-one. ...

2012-07-25T23:59:59.000Z

292

ELECTRON WELDING OF METALS  

SciTech Connect

The advantages and disadvantages of the electron welding of metals are briefly reviewed. Typical apparatuses used for electron welding are described. (J.S.R)

Stohr, J.-A.

1958-03-01T23:59:59.000Z

293

Foil Electron Multiplier  

NLE Websites -- All DOE Office Websites (Extended Search)

Multiplier Foil Electron Multiplier An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident...

294

Controlling Graphene's Electronic Structure  

NLE Websites -- All DOE Office Websites (Extended Search)

Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in...

295

Controlling Graphene's Electronic Structure  

NLE Websites -- All DOE Office Websites (Extended Search)

Controlling Graphene's Electronic Structure Print Wednesday, 25 April 2007 00:00 Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has...

296

Polarizing Microscopes  

Science Conference Proceedings (OSTI)

... NIKON SINGAPORE PTE LTD SINGAPORE Phone: +65-5593618 Fax: +65-5593668 NIKON MALAYSIA SDN. BHD. MALAYSIA ...

2011-05-17T23:59:59.000Z

297

Energy Storage & Power Electronics 2008 Peer Review - Power Electronic...  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

& Power Electronics 2008 Peer Review - Power Electronics (PE) Systems Presentations Energy Storage & Power Electronics 2008 Peer Review - Power Electronics (PE) Systems...

298

Electronics Stewardship and Data Center  

NLE Websites -- All DOE Office Websites (Extended Search)

of electronic stewardship: Procurement of environmentally preferable electronics Enable electronics power management capabilities Establish and implement policies to extend the...

299

Electronics and Telecommunications Portal  

Science Conference Proceedings (OSTI)

... Quantum Electrical Measurements; Quantum Information and ... The working of countless electronic devices involves electric and magnetic ...

2013-06-27T23:59:59.000Z

300

Atomic-Resolution STEM at Low Primary Energies  

Science Conference Proceedings (OSTI)

Aberration-corrected scanning transmission electron microscopes (STEMs) can now produce electron probes as small as 1 {angstrom} at 60 keV. This level of performance allows individual light atoms to be imaged in various novel materials including graphene, monolayer boron nitride, and carbon nanotubes. Operation at 60 keV avoids direct knock-on damage in such materials, but some radiation damage often remains, and limits the maximum usable electron dose. Elemental identification by electron energy loss spectroscopy (EELS) is then usefully supplemented by annular dark-field (ADF) imaging, for which the signal is much larger and the spatial resolution significantly better. Because of its strong dependence on the atomic number Z, ADF can be used to identify the chemical type of individual atoms, both heavy and light. We review the instrumental requirements for atomic resolution imaging at 60 keV and lower energies, and we illustrate the kinds of studies that have now become possible by ADF images of graphene, monolayer BN, and single-wall carbon nanotubes, and by ADF images and EEL spectra of carbon nanotubes containing nanopods filled with single atoms of Er. We then discuss likely future developments.

Krivanek, Ondrej L. [Nion Co; Chisholm, Matthew F [ORNL; Dellby, N. [Nion Company, WA; Murfitt, M. F. [Nion Company, WA

2011-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


301

Seminar Announcement Nanoscale High Field Chemistry with the Atomic Force Microscope and Patterning January 15, 2009  

NLE Websites -- All DOE Office Websites (Extended Search)

SEMINAR SEMINAR ANNOUNCMENT Thursday, January 15, 2009 11:00am - 12:00 noon EMSL Boardroom Nanoscale High Field Chemistry With the Atomic Force Microscope and Patterning Marco Rolandi Assistant Professor Department of Materials Science and Engineering, University of Washington, Seattle, WA 98195 Facile and affordable processes for the fabrication of nanostructures are fundamental to future endeavors in nanoscale science and engineering. The atomic force microscope was designed primarily for imaging, and has evolved into a versatile tool for nanoscale surface modification. We have developed an AFM based scheme capable of direct writing of glassy carbon nanowires as fast as 1 cm/s. In brief, when a bias is applied across the tip-sample gap a molecular precursor undergoes high field reactions that result in the deposition of a cross- linked product on the surface. In order to gain a

302

Design of a neutron penumbral-aperture microscope with 10-. mu. m resolution  

SciTech Connect

We are currently designing a 10-{mu}m resolution neutron penumbral-aperture microscope to diagnose high-convergence targets at the Nova laser facility. To achieve such high resolution, the new microscope will require substantial improvements in three areas. First, we have designed thick penumbral apertures with extremely sharp cutoffs over a useful ({approx}100 {mu}m) field of view; fabrication of such apertures appears feasible using gold electroplating techniques. Second, the limited field of view and required close proximity of the aperture to the target (2 cm) necessitates a durable mounting and alignment system with {plus}25 {mu}m accuracy. Finally, a neutron detector containing 160,000 scintillator elements is required; readout and optimization of this large array are outstanding issues. 5 refs., 3 figs.

Ress, D.; Lerche, R.A.; Ellis, R.J.; Lane, S.M.

1990-05-01T23:59:59.000Z

303

Spectro-microscopic Measurements of Carbonaceous Aerosol Aging in Central California  

NLE Websites -- All DOE Office Websites (Extended Search)

Spectro-microscopic Measurements of Carbonaceous Spectro-microscopic Measurements of Carbonaceous Aerosol Aging in Central California For original submission and image(s), see ARM Research Highlights http://www.arm.gov/science/highlights/ Research Highlight Atmospheric aerosols affect climate by scattering and absorbing sunlight and by modifying the properties of clouds. However, there are gaps in our understanding of chemical processes involving these airborne particulates, and these gaps contribute significantly to uncertainties in predicting future climate change. Developing more- accurate global climate models requires a more complete understanding of the aerosol lifecycle, from initial particle formation to loss through incorporation into precipitating clouds or dry deposition. In research published in the journal Atmospheric Chemistry and Physics, a team of

304

Microscopic description of large-amplitude shape-mixing dynamics with local QRPA inertial functions  

E-Print Network (OSTI)

We introduce a microscopic approach to derive all the inertial functions in the five-dimensional quadrupole collective Hamiltonian. Local normal modes are evaluated on the constrained mean field in the quasiparticle random-phase approximation in order to derive the inertial functions. The collective Hamiltonians for neutron-rich Mg isotopes are determined with use of this approach, and the shape coexistence/mixing around the N = 20 region is analyzed.

Hinohara, Nobuo; Yoshida, Kenichi; Nakatsukasa, Takashi; Matsuo, Masayuki

2011-01-01T23:59:59.000Z

305

Microscopic description of large-amplitude shape-mixing dynamics with local QRPA inertial functions  

Science Conference Proceedings (OSTI)

We introduce a microscopic approach to derive all the inertial functions in the five-dimensional quadrupole collective Hamiltonian. Local normal modes are evaluated on the constrained mean field in the quasiparticle random-phase approximation in order to derive the inertial functions. The collective Hamiltonians for neutron-rich Mg isotopes are determined with use of this approach, and the shape coexistence/mixing around the N = 20 region is analyzed.

Hinohara, Nobuo; Yoshida, Kenichi; Nakatsukasa, Takashi [Theoretical Nuclear Physics Laboratory, RIKEN Nishina Center, Wako 351-0198 (Japan); Sato, Koichi [Department of Physics, Graduate School of Science, Kyoto University, Kyoto 606-8502 (Japan); Theoretical Nuclear Physics Laboratory, RIKEN Nishina Center, Wako 351-0198 (Japan); Matsuo, Masayuki [Department of Physics, Faculty of Science, Niigata University, Niigata 950-2181 (Japan)

2011-05-06T23:59:59.000Z

306

Microscopic surface structure of C/SiC composite mirrors for space cryogenic telescopes  

E-Print Network (OSTI)

We report on the microscopic surface structure of carbon-fiber-reinforced silicon carbide (C/SiC) composite mirrors that have been improved for the Space Infrared Telescope for Cosmology and Astrophysics (SPICA) and other cooled telescopes. The C/SiC composite consists of carbon fiber, silicon carbide, and residual silicon. Specific microscopic structures are found on the surface of the bare C/SiC mirrors after polishing. These structures are considered to be caused by the different hardness of those materials. The roughness obtained for the bare mirrors is 20 nm rms for flat surfaces and 100 nm rms for curved surfaces. It was confirmed that a SiSiC slurry coating is effective in reducing the roughness to 2 nm rms. The scattering properties of the mirrors were measured at room temperature and also at 95 K. No significant change was found in the scattering properties through cooling, which suggests that the microscopic surface structure is stable with changes in temperature down to cryogenic values. The C/SiC mirror with the SiSiC slurry coating is a promising candidate for the SPICA telescope.

Keigo Enya; Takao Nakagawa; Hidehiro Kaneda; Takashi Onaka; Tuyoshi Ozaki; Masami Kume

2007-07-10T23:59:59.000Z

307

Microscopic surface structure of C/SiC composite mirrors for space cryogenic telescopes  

E-Print Network (OSTI)

We report on the microscopic surface structure of carbon-fiber-reinforced silicon carbide (C/SiC) composite mirrors that have been improved for the Space Infrared Telescope for Cosmology and Astrophysics (SPICA) and other cooled telescopes. The C/SiC composite consists of carbon fiber, silicon carbide, and residual silicon. Specific microscopic structures are found on the surface of the bare C/SiC mirrors after polishing. These structures are considered to be caused by the different hardness of those materials. The roughness obtained for the bare mirrors is 20 nm rms for flat surfaces and 100 nm rms for curved surfaces. It was confirmed that a SiSiC slurry coating is effective in reducing the roughness to 2 nm rms. The scattering properties of the mirrors were measured at room temperature and also at 95 K. No significant change was found in the scattering properties through cooling, which suggests that the microscopic surface structure is stable with changes in temperature down to cryogenic values. The C/SiC ...

Enya, Keigo; Kaneda, Hidehiro; Onaka, Takashi; Ozaki, Tuyoshi; Kume, Masami

2007-01-01T23:59:59.000Z

308

SEM technique for imaging and measuring electronic transport in nanocomposites based on electric field induced contrast  

DOE Patents (OSTI)

Methods and apparatus are described for SEM imaging and measuring electronic transport in nanocomposites based on electric field induced contrast. A method includes mounting a sample onto a sample holder, the sample including a sample material; wire bonding leads from the sample holder onto the sample; placing the sample holder in a vacuum chamber of a scanning electron microscope; connecting leads from the sample holder to a power source located outside the vacuum chamber; controlling secondary electron emission from the sample by applying a predetermined voltage to the sample through the leads; and generating an image of the secondary electron emission from the sample. An apparatus includes a sample holder for a scanning electron microscope having an electrical interconnect and leads on top of the sample holder electrically connected to the electrical interconnect; a power source and a controller connected to the electrical interconnect for applying voltage to the sample holder to control the secondary electron emission from a sample mounted on the sample holder; and a computer coupled to a secondary electron detector to generate images of the secondary electron emission from the sample.

Jesse, Stephen (Knoxville, TN); Geohegan, David B. (Knoxville, TN); Guillorn, Michael (Brooktondale, NY)

2009-02-17T23:59:59.000Z

309

NIST: Ultraviolet Photoemission Electron Microscopy  

Science Conference Proceedings (OSTI)

Ultraviolet Photoemission Electron Microscopy. Summary: Ultraviolet photoemission electron microscopy is used to study ...

2012-11-19T23:59:59.000Z

310

ME EET Seminar: Nanomanufacturing of Flexible Electronics and Energy  

NLE Websites -- All DOE Office Websites (Extended Search)

ME EET Seminar: Nanomanufacturing of Flexible Electronics and Energy ME EET Seminar: Nanomanufacturing of Flexible Electronics and Energy Systems Speaker(s): Costas Grigoropoulos Date: October 28, 2009 - 12:00pm Location: 90-3122 This talk presents an overview of recent work conducted on the nanomanufacturing of flexible electronics and energy systems. Pulsed lasers have been coupled to near-field-scanning optical microscopes (NSOMs) for nanoprocessing, nanomachining, nanolithography and nanodeposition. Interactions of pulsed laser radiation with nanostructures are investigated and shown to substantially improve contact resistance and device performance compared to furnace annealing. New concepts have been demonstrated for the high throughput, directed growth and assembly of nanostructures. Maskless fabrication of functional devices on flexible

311

Integrated Dynamic Electron Solutions, Inc. | Department of Energy  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

Integrated Integrated Dynamic Electron Solutions, Inc. America's Next Top Energy Innovator Challenge 333 likes Integrated Dynamic Electron Solutions, Inc. Lawrence Livermore National Laboratory Dynamic Transmission Electron Microscopes DTEM reveal unprecedented details of the mechanisms underlying a host of nanoscale systems that are at the core of our current and future energy economy. A vast and growing number of materials utilized in the energy sector rely on nanostructured materials and their unique dynamic behaviors. DTEM offers researchers the ability to directly interrogate these materials at time and length scales that to-date have either been impossible to access or required the use of multi-billion dollar synchrotrons. DTEM will fundamentally change the approach to basic and applied research in the

312

Integrated Dynamic Electron Solutions, Inc. | Department of Energy  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

Integrated Integrated Dynamic Electron Solutions, Inc. America's Next Top Energy Innovator Challenge 333 likes Integrated Dynamic Electron Solutions, Inc. Lawrence Livermore National Laboratory Dynamic Transmission Electron Microscopes DTEM reveal unprecedented details of the mechanisms underlying a host of nanoscale systems that are at the core of our current and future energy economy. A vast and growing number of materials utilized in the energy sector rely on nanostructured materials and their unique dynamic behaviors. DTEM offers researchers the ability to directly interrogate these materials at time and length scales that to-date have either been impossible to access or required the use of multi-billion dollar synchrotrons. DTEM will fundamentally change the approach to basic and applied research in the

313

Integrated Dynamic Electron Solutions, Inc. | Department of Energy  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

Integrated Integrated Dynamic Electron Solutions, Inc. America's Next Top Energy Innovator Challenge 333 likes Integrated Dynamic Electron Solutions, Inc. Lawrence Livermore National Laboratory Dynamic Transmission Electron Microscopes DTEM reveal unprecedented details of the mechanisms underlying a host of nanoscale systems that are at the core of our current and future energy economy. A vast and growing number of materials utilized in the energy sector rely on nanostructured materials and their unique dynamic behaviors. DTEM offers researchers the ability to directly interrogate these materials at time and length scales that to-date have either been impossible to access or required the use of multi-billion dollar synchrotrons. DTEM will fundamentally change the approach to basic and applied research in the

314

Polarization Control of Electron Tunneling into Ferroelectric Surfaces  

SciTech Connect

We demonstrate a highly reproducible control of local electron transport through a ferroelectric oxide via its spontaneous polarization. Electrons are injected from the tip of an atomic force microscope into a thin film of lead-zirconate titanate, Pb(Zr0.2Ti0.8)O3, in the regime of electron tunneling assisted by a high electric field (Fowler-Nordheim tunneling). The tunneling current exhibits a pronounced hysteresis with abrupt switching events that coincide, within experimental resolution, with the local switching of ferroelectric polarization. The large spontaneous polarization of the PZT film results in up to 500-fold amplification of the tunneling current upon ferroelectric switching. The magnitude of the effect is subject to electrostatic control via ferroelectric switching, suggesting possible applications in ultrahigh-density data storage and spintronics.

Maksymovych, Petro [ORNL; Jesse, Stephen [ORNL; Yu, Pu [University of California, Berkeley; Ramesh, R. [University of California, Berkeley; Baddorf, Arthur P [ORNL; Kalinin, Sergei V [ORNL

2009-01-01T23:59:59.000Z

315

Analytical electron microscopy characterization of uranium-contaminated soils from the Fernald Site, FY1993 report  

SciTech Connect

A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM) is being used to determine the nature of uranium in soils from the Fernald Environmental Management Project. The information gained from these studies is being used to develop and test remediation technologies. Investigations using SEM have shown that uranium is contained within particles that are typically 1 to 100 {mu}m in diameter. Further analysis with AEM has shown that these uranium-rich regions are made up of discrete uranium-bearing phases. The distribution of these uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Cunnane, J.C.; Brown, N.R.; Dietz, N.L.

1994-10-01T23:59:59.000Z

316

Chapter 9: Electronics  

SciTech Connect

Sophisticated front-end electronics are a key part of practically all modern radiation detector systems. This chapter introduces the basic principles and their implementation. Topics include signal acquisition, electronic noise, pulse shaping (analog and digital), and data readout techniques.

Grupen, Claus; Shwartz, Boris A.

2006-12-19T23:59:59.000Z

317

Electron Photon Absorbed Dose  

Science Conference Proceedings (OSTI)

... is in progress, with preliminary results obtained for both high-energy electrons (at the ... of Clinac 12 MeV, 16 MeV and 20 MeV electron beams at ...

2013-03-13T23:59:59.000Z

318

Catalac free electron laser  

DOE Patents (OSTI)

A catalac free electron laser using a rf linac (catalac) which acts as a catalyst to accelerate an electron beam in an initial pass through the catalac and decelerate the electron beam during a second pass through the catalac is described. During the second pass through the catalac, energy is extracted from the electron beam and transformed to energy of the accelerating fields of the catalac to increase efficiency of the device. Various embodiments disclose the use of post linacs to add electron beam energy extracted by the wiggler and the use of supplementary catalacs to extract energy at various energy peaks produced by the free electron laser wiggler to further enhance efficiency of the catalac free electron laser. The catalac free electron laser can be used in conjunction with a simple resonator, a ring resonator, or as an amplifier in conjunction with a master oscillator laser.

Brau, C.A.; Swenson, D.A.; Boyd, T.J. Jr.

1979-12-12T23:59:59.000Z

319

Relativistic electron beam generator  

DOE Patents (OSTI)

A relativistic electron beam generator for laser media excitation is described. The device employs a diode type relativistic electron beam source having a cathode shape which provides a rectangular output beam with uniform current density.

Mooney, L.J.; Hyatt, H.M.

1975-11-11T23:59:59.000Z

320

Catalac free electron laser  

DOE Patents (OSTI)

A catalac free electron laser using a rf linac (catalac) which acts as a catalyst to accelerate an electron beam in an initial pass through the catalac and decelerate the electron beam during a second pass through the catalac. During the second pass through the catalac, energy is extracted from the electron beam and transformed to energy of the accelerating fields of the catalac to increase efficiency of the device. Various embodiments disclose the use of post linacs to add electron beam energy extracted by the wiggler and the use of supplementary catalacs to extract energy at various energy peaks produced by the free electron laser wiggler to further enhance efficiency of the catalac free electron laser. The catalac free electron laser can be used in conjunction with a simple resonator, a ring resonator or as an amplifier in conjunction with a master oscillator laser.

Brau, Charles A. (Los Alamos, NM); Swenson, Donald A. (Los Alamos, NM); Boyd, Jr., Thomas J. (Los Alamos, NM)

1982-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


321

FREE-ELECTRON LASERS  

E-Print Network (OSTI)

1977. First Operation of a Free-Electron Laser. Phys . __Radiation from a High-Gain Free-Electeon Lasee Amplifier. ~1984. Variable-Wiggler Free-Electron-Laser Oscillat.ion.

Sessler, A.M.

2008-01-01T23:59:59.000Z

322

Foil Electron Multiplier  

NLE Websites -- All DOE Office Websites (Extended Search)

Foil Electron Multiplier Foil Electron Multiplier Foil Electron Multiplier An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. Available for thumbnail of Feynman Center (505) 665-9090 Email Foil Electron Multiplier An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. The foil thickness enables the incident particles to travel through the foil and continue on

323

[Inelastic electron scattering from surfaces]. [Annual] progress report  

Science Conference Proceedings (OSTI)

This program is aimed at the quantitative study of surface dynamical processes (vibrational, magnetic excitations) in crystalline slabs, ultrathin-layered materials, and chemisorbed systems on substrates, and of the geometric structure connected to these dynamical excitations. High-resolution electron-energy loss spectroscopy (HREELS) is a powerful probe. Off-specular excitation cross sections are much larger if electron energies are in the LEED range (50-300 eV). The analyses has been used to study surfaces of ordered alloys (NiAl). Ab-initio surface lattice dynamical results were combined with phonon-loss cross sections to achieve a more accurate microscopic description. First-principles phonon eigenvectors and eigenfrequencies were used as inputs to electron-energy-loss multiple scattering cross-section calculations. The combined microscopic approach was used to analyze EELS data of Cu(0001) and Ag(001) at two points. Positron diffraction is discussed as a structural and imaging tool. The relation between geometric structure of a film and its local magnetic properties will be studied in the future, along with other things.

Not Available

1993-10-01T23:59:59.000Z

324

Electronic Materials: Web resources  

Science Conference Proceedings (OSTI)

Jan 11, 2008 ... WEB: NETWORKS MATEC, Maricopa Community Colleges. NSF resource center focused on semiconductor and electronics education, 0, 811 ...

325

Electron Based Techniques  

Science Conference Proceedings (OSTI)

Mar 5, 2013 ... Characterization of Materials through High Resolution Coherent Imaging: Electron Based Techniques Sponsored by: TMS Structural Materials ...

326

Electron Backscatter Diffraction  

Science Conference Proceedings (OSTI)

Oct 19, 2011 ... Recent Advances in Structural Characterization of Materials: Electron Backscatter Diffraction Sponsored by: MS&T Organization Program ...

327

BNL | CFN: Electronic Nanomaterials  

NLE Websites -- All DOE Office Websites (Extended Search)

goals of our CFN research program in Electronic Nanomaterials involve implementing nanostructures for photovoltaic, photochemical, and electrochemical energy conversion. Our...

328

Auger electron spectroscopy  

SciTech Connect

A review of Auger electron spectroscopy is presented. Methods, resolution, sensitivity, and uses are discussed. 30 references, 10 figures. (GHT)

Somorjai, G.A.

1980-12-01T23:59:59.000Z

329

ELECTRONICS AND ELECTRICAL  

Science Conference Proceedings (OSTI)

... DSP-based signal generator and analyzer to ... background and provide direct measurement of ... temperature electronics to drive our superconducting ...

2012-10-27T23:59:59.000Z

330

Usage of Electronic Monograph  

Science Conference Proceedings (OSTI)

Usage of Electronic Monograph. The following table shows the approximate usage of the monograph since April 1998. ...

2013-08-02T23:59:59.000Z

331

Research and Design of a Sample Heater for Beam Line 6-2c Transmission X-ray Microscope  

Science Conference Proceedings (OSTI)

There exists a need for environmental control of samples to be imaged by the Transmission X-Ray Microscope (TXM) at the SSRLs Beam Line 6-2c. In order to observe heat-driven chemical or morphological changes that normally occur in situ, microscopes require an additional component that effectively heats a given sample without heating any of the microscope elements. The confinement of the heat and other concerns about the heaters integrity limit which type of heater is appropriate for the TXM. The bulk of this research project entails researching different heating methods used previously in microscopes, but also in other industrial applications, with the goal of determining the best-fitting method, and finally in designing a preliminary sample heater.

Policht, Veronica; /Loyola U., Chicago /SLAC

2012-08-27T23:59:59.000Z

332

High Resolution Quantitative Auto-Radiography to determine microscopic distributions of B-10 in neutron capture therapy  

E-Print Network (OSTI)

The success of Boron Neutron Capture Therapy (BNCT) is heavily dependent on the microscopic distribution of B-10 in tissue. High Resolution Quantitative Auto-Radiography (HRQAR) is a potentially valuable analytical tool ...

Harris, Thomas C. (Thomas Cameron)

2006-01-01T23:59:59.000Z

333

A new Scanning Transmission X-ray Microscope at the ALS for operation up to 2500eV  

E-Print Network (OSTI)

X-ray Microscope at the ALS for operation up to 2500eV DavidLight Source [2]. In the new ALS facility the energy rangein the two existing STXMs at ALS and a flexible platform for

Kilcoyne, David

2010-01-01T23:59:59.000Z

334

Microscopic Analysis of Agriculture Products, 4th EditionChapter 5 Detecting Animal Products in Feeds and Feed Ingredients  

Science Conference Proceedings (OSTI)

Microscopic Analysis of Agriculture Products, 4th Edition Chapter 5 Detecting Animal Products in Feeds and Feed Ingredients Methods and Analyses eChapters Methods - Analyses Books Press Downloadable pdf of Chapter

335

Electron beam device  

DOE Patents (OSTI)

This patent pertains to an electron beam device in which a hollow target is symmetrically irradiated by a high energy, pulsed electron beam about its periphery and wherein the outer portion of the target has a thickness slightly greater than required to absorb the electron beam pulse energy. (auth)

Beckner, E.H.; Clauser, M.J.

1975-08-12T23:59:59.000Z

336

ELECTRONS IN NONPOLAR LIQUIDS.  

Science Conference Proceedings (OSTI)

Excess electrons can be introduced into liquids by absorption of high energy radiation, by photoionization, or by photoinjection from metal surfaces. The electron's chemical and physical properties can then be measured, but this requires that the electrons remain free. That is, the liquid must be sufficiently free of electron attaching impurities for these studies. The drift mobility as well as other transport properties of the electron are discussed here as well as electron reactions, free-ion yields and energy levels, Ionization processes typically produce electrons with excess kinetic energy. In liquids during thermalization, where this excess energy is lost to bath molecules, the electrons travel some distance from their geminate positive ions. In general the electrons at this point are still within the coulombic field of their geminate ions and a large fraction of the electrons recombine. However, some electrons escape recombination and the yield that escapes to become free electrons and ions is termed G{sub fi}. Reported values of G{sub fi} for molecular liquids range from 0.05 to 1.1 per 100 eV of energy absorbed. The reasons for this 20-fold range of yields are discussed here.

HOLROYD,R.A.

2002-10-22T23:59:59.000Z

337

Electronic collection management and electronic information services  

Science Conference Proceedings (OSTI)

As the life cycle of information products has become increasingly digital from “cradle to grave”, the nature of electronic information management has dramatically changed. These changes have brought new strategies and methods as well as new ...

Gladys Cotter; Bonnie Carroll; Gail Hodge; Andrea Japzon

2005-01-01T23:59:59.000Z

338

Microscopic description of the odd-even effect in cold fission  

E-Print Network (OSTI)

The time dependent equations of motion for the pair breaking effect were corroborated with a condition that fixes dynamically the number of particles on the two fission fragment. The single particle level scheme was calculated with the Woods-Saxon superasymmetric two center shell model. This model provides a continuous variation of the energies from one nucleus up to two separated fragments. The dissipated energy resorts from the time dependent pairing equations. A peculiar phenomenon was observed experimentally in cold fission: the odd partition yields are favored over the even ones. This odd-even effect for cold fission was explained microscopically.

M. Mirea

2013-09-27T23:59:59.000Z

339

Evidence of microscopic effects in fragment mass distribution in heavy ion induced fusion-fission reactions  

E-Print Network (OSTI)

Our measurements of variances ($\\sigma_{m}^2$) in mass distributions of fission fragments from fusion-fission reactions of light projectiles (C, O and F) on deformed thorium targets exhibit a sharp anomalous increase with energy near the Coulomb barrier, in contrast to the smooth variation of $\\sigma_{m}^2$ for the spherical bismuth target. This departure from expectation based on a statistical description is explained in terms of microscopic effects arising from the orientational dependence in the case of deformed thorium targets.

T. K. Ghosh; S. Pal; K. S. Gold; P. Bhattacharya

2005-06-27T23:59:59.000Z

340

MICROSCOPIC METABOLISM OF CALCIUM IN BONE. III. MICRORADIOGRAPHIC MEASUREMENTS OF MINERAL DENSITY  

SciTech Connect

The range of microscopic calcium densities in man and in dog does not change wiih the age of the individual. The ranges, however. are not the same in the two species. New bone mineral in the dog is formed at higher density than similar mineral in man, and highly mineralized bone in the dog is more dense than the most dense bone in man. Thus species differcnces in calcium metabolism of bone do exist and should not be overlooked in the intercomparison of the uptake and retention of the alkaline earths in mammalian skeletons. (auth)

Rowland, R.E.; Jowsey, J.; Marshall, J.H.

1959-02-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


341

Quantum-Mechanical Model of Spacetime I: Microscopic Properties of Spacetime  

E-Print Network (OSTI)

This is the first part in a series of two papers, where we consider a specific microscopic model of spacetime. In our model Planck size quantum black holes are taken to be the fundamental building blocks of space and time. Spacetime is assumed to be a graph, where black holes lie on the vertices. In this first paper we construct our model in details, and show how classical spacetime emerges at the long distance limit from our model. We also consider the statistics of spacetime.

Makela, J

2008-01-01T23:59:59.000Z

342

A Simple Quantum-Mechanical Model of Spacetime I: Microscopic Properties of Spacetime  

E-Print Network (OSTI)

This is the first part in a series of two papers, where we consider a specific microscopic model of spacetime. In our model Planck size quantum black holes are taken to be the fundamental building blocks of space and time. Spacetime is assumed to be a graph, where black holes lie on the vertices. In this first paper we construct our model in details, and show how classical spacetime emerges at the long distance limit from our model. We also consider the statistics of spacetime.

J. Makela

2008-05-26T23:59:59.000Z

343

Design of a scanning gate microscope in a cryogen-free dilution refrigerator  

E-Print Network (OSTI)

We report on our design of a scanning gate microscope housed in a cryogen-free dilution refrigerator with a base temperature of 15 mK. The recent increase in efficiency of pulse tube cryocoolers has made cryogen-free systems popular in recent years. However, this new style of cryostat presents challenges for performing scanning probe measurements, mainly as a result of the vibrations introduced by the cryocooler. We demonstrate scanning with root-mean-square vibrations of 0.8 nm at 3 K and 2.1 nm at 15 mK in a 1 kHz bandwidth with our design.

Pelliccione, Matthew; Bartel, John; Keller, Andrew; Goldhaber-Gordon, David

2012-01-01T23:59:59.000Z

344

Sensors, Electronics & Instrumentation  

NLE Websites -- All DOE Office Websites (Extended Search)

Sensors, Electronics & Instrumentation Sensors, Electronics & Instrumentation Sensors, Electronics & Instrumentation Express Licensing Acoustic Concentration Of Particles In Fluid Flow Express Licensing Apparatus And Method For Hydrogen And Oxygen Mass Spectrometry Of The Terrestrial Magnetosphere Express Licensing Apparatus And Method For Temperature Correction And Expanded Count Rate Of Inorganic Scintillation Detectors Express Licensing Composition and method for removing photoresist materials from electronic components Express Licensing Corrosion Test Cell For Bipolar Plates Express Licensing Cylindrical Acoustic Levitator/Concentrator Negotiable Licensing Electrochemical Apparatus with Disposable and Modifiable Parts Express Licensing Foil electron multiplier Express Licensing Hydrogen Sensor

345

JLAB Electron Driver Capabilities  

Science Conference Proceedings (OSTI)

Several schemes have been proposed for adding a positron beam option at the Continuous Electron Beam Facility (CEBAF) at Jefferson Laboratory (JLAB). They involve using a primary beam of electrons or gamma rays striking a target to produce a positron beam. At JLAB electron beams are produced and used in two different accelerators, CEBAF and the JLAB FEL (Free Electron Laser). Both have low emittance and energy spread. The CEBAF beam is polarized. The FEL beam is unpolarized but the injector can produce a higher current electron beam. In this paper we describe the characteristics of these beams and the parameters relevant for positron production.

Kazimi, Reza [Jefferson Lab, 12000 Jefferson Avenue, Newport News, VA 23606 (United States)

2009-09-02T23:59:59.000Z

346

High brightness electron accelerator  

DOE Patents (OSTI)

A compact high brightness linear accelerator is provided for use, e.g., in a free electron laser. The accelerator has a first plurality of acclerating cavities having end walls with four coupling slots for accelerating electrons to high velocities in the absence of quadrupole fields. A second plurality of cavities receives the high velocity electrons for further acceleration, where each of the second cavities has end walls with two coupling slots for acceleration in the absence of dipole fields. The accelerator also includes a first cavity with an extended length to provide for phase matching the electron beam along the accelerating cavities. A solenoid is provided about the photocathode that emits the electrons, where the solenoid is configured to provide a substantially uniform magnetic field over the photocathode surface to minimize emittance of the electrons as the electrons enter the first cavity.

Sheffield, R.L.; Carlsten, B.E.; Young, L.M.

1992-12-31T23:59:59.000Z

347

Low temperature scanning tunneling microscope study of low-dimensional superconductivity on metallic nanostructures.  

E-Print Network (OSTI)

??Superconductivity is a remarkable quantum phenomenon in which a macroscopic number of electrons form a condensate of Cooper pairs that can be described by a… (more)

Kim, Jungdae

2011-01-01T23:59:59.000Z

348

Vehicle Technologies Office: Power Electronics  

NLE Websites -- All DOE Office Websites (Extended Search)

Power Electronics to Power Electronics to someone by E-mail Share Vehicle Technologies Office: Power Electronics on Facebook Tweet about Vehicle Technologies Office: Power Electronics on Twitter Bookmark Vehicle Technologies Office: Power Electronics on Google Bookmark Vehicle Technologies Office: Power Electronics on Delicious Rank Vehicle Technologies Office: Power Electronics on Digg Find More places to share Vehicle Technologies Office: Power Electronics on AddThis.com... Just the Basics Hybrid & Vehicle Systems Energy Storage Advanced Power Electronics & Electrical Machines Power Electronics Electrical Machines Thermal Control & System Integration Advanced Combustion Engines Fuels & Lubricants Materials Technologies Power Electronics The power electronics activity focuses on research and development (R&D)

349

Physics Out Loud - Electron Scattering  

NLE Websites -- All DOE Office Websites (Extended Search)

(Electromagnetic Force) Physics Out Loud Main Index Next Video (Electrons) Electrons Electron Scattering Jefferson Lab's Hall A Leader, Cynthia Keppel, explains how nuclear...

350

Convergence of methods for coupling of microscopic and mesoscopic reaction-diffusion simulations  

E-Print Network (OSTI)

In this paper, three multiscale methods for coupling of mesoscopic (compartment-based) and microscopic (molecular-based) stochastic reaction-diffusion simulations are investigated. Two of the three methods that will be discussed in detail have been previously reported in the literature; the two-regime method (TRM) and the compartment-placement method (CPM). The third method that is introduced and analysed in this paper is the ghost cell method (GCM). Presented is a comparison of sources of error. The convergent properties of this error are studied as the time step $\\Delta t$ (for updating the molecular-based part of the model) approaches zero. It is found that the error behaviour depends on another fundamental computational parameter $h$, the compartment size in the mesoscopic part of the model. Two important limiting cases, which appear in applications, are considered: (i) \\Delta t approaches 0 and h is fixed; and (ii) \\Delta t approaches 0 and h approaches 0 such that \\Delta t/h^2 is fixed. The error for previously developed approaches (the TRM and CPM) converges to zero only in the limiting case (ii), but not in case (i). It is shown that the error of the GCM converges in the limiting case (i). Thus the GCM is superior to previous coupling techniques if the mesoscopic description is much coarser than the microscopic part of the model.

Mark B Flegg; Stefan Hellander; Radek Erban

2013-04-27T23:59:59.000Z

351

Microscopic models and effective equation of state in nuclear collisions at FAIR energies  

E-Print Network (OSTI)

Two microscopic models, UrQMD and QGSM, were employed to study the formation of locally equilibrated hot and dense nuclear matter in heavy-ion collisions at energies from 11.6 AGeV to 160 AGeV. Analysis was performed for the fixed central cubic cell of volume V = 125 fm**3 and for the expanding cell which followed the growth of the central area with uniformly distributed energy. To decide whether or not the equilibrium was reached, results of the microscopic calculations were compared to that of the statistical thermal model. Both dynamical models indicate that the state of kinetic, thermal and chemical equilibrium is nearly approached at any bombarding energy after a certain relaxation period. The higher the energy, the shorter the relaxation time. Equation of state has a simple linear dependence P = a(sqrt{s})*e, where a = c_s**2 is the sound velocity squared. It varies from 0.12 \\pm 0.01 at E_{lab} = 11.6 AGeV to 0.145 \\pm 0.005 at E_{lab} = 160 AGeV. Change of the slope in a(sqrt{s}) behavior occurs at E_...

Bravina, L; Bleibel, J; Bleicher, M; Burau, G; Faessler, Amand; Fuchs, C; Nilsson, M S; Stöcker, H; Tywoniuk, K; Zabrodin, E

2008-01-01T23:59:59.000Z

352

Nanoscale modulations in (KLa)(CaW)O-6 and (NaLa)(CaW)O-6  

Science Conference Proceedings (OSTI)

Complex nanoscale modulations are identified in two new A-site ordered perovskites, (KLa)(CaW)O{sub 6} and (NaLa)(CaW)O{sub 6}. In (KLa)(CaW)O{sub 6}, selected-area electron diffraction (SAED) and high-resolution transmission electron microscopy (HRTEM) show an incommensurate nanocheckerboard modulation with {approx}9.4 x 9.4 a{sub p} periodicity (a{sub p} {approx} 4 {angstrom} for the cubic perovskite aristotype). For (NaLa)(CaW)O{sub 6} a one-dimensional modulation is observed with a {approx}16(1 1 0)a{sub p} repeat; the orientation of the nanostripes is different from the stripes observed in other mixed A-site systems. Studies using high temperature x-ray diffraction suggest the formation of the complex modulations is associated with small deviations from the ideal 1:1:1:1 stoichiometry of the (A{sup +}La{sup 3+})(CaW)O{sub 6} phases. Z-contrast images acquired on an aberration-corrected microscope provide evidence for deviations from stoichiometry with a {approx}1:15 periodic arrangement of La{sub 4/3}(CaW)O{sub 6}:(NaLa)(CaW)O{sub 6} nano-phases.

Licurse, Mark [University of Pennsylvania; Borisevich, Albina Y [ORNL; Davies, Peter [University of Pennsylvania

2012-01-01T23:59:59.000Z

353

Field emission electron source  

DOE Patents (OSTI)

A novel field emitter material, field emission electron source, and commercially feasible fabrication method is described. The inventive field emission electron source produces reliable electron currents of up to 400 mA/cm.sup.2 at 200 volts. The emitter is robust and the current it produces is not sensitive to variability of vacuum or the distance between the emitter tip and the cathode. The novel emitter has a sharp turn-on near 100 volts.

Zettl, Alexander Karlwalter (Kensington, CA); Cohen, Marvin Lou (Berkeley, CA)

2000-01-01T23:59:59.000Z

354

NIST Electron Paramagnetic Resonance Facility  

Science Conference Proceedings (OSTI)

... leading a national and international effort in electron paramagnetic resonance ... centers (molecules or atoms with unpaired electrons) are produced ...

355

Electronic Nanodevices Laboratory  

Science Conference Proceedings (OSTI)

... such as charge and energy transfer occur at ... screened for their potential integration into electronic ... of electrical transport processes in such systems. ...

2010-10-05T23:59:59.000Z

356

Scanning Electron Microscopy  

Science Conference Proceedings (OSTI)

... Bob Gordon of Hitachi explains that the electrons are produced by a tungsten filament, just like in an incandescent light bulb, but since the sample ...

2013-12-06T23:59:59.000Z

357

Electron Beam Melting (EBM)  

Science Conference Proceedings (OSTI)

Oct 18, 2011 ... Additive Manufacturing of Metals: Electron Beam Melting (EBM) I Sponsored by: MS&T Organization Program Organizers: Ian D. Harris, EWI; ...

358

Metrology Electron Microscopy  

Science Conference Proceedings (OSTI)

Metrology Electron Microscopy. Technical Contact: Joseph (Joe) Fu. 301-975-3795. Figure 1. SRM 484f Sample and its Micrograph. ...

2011-10-28T23:59:59.000Z

359

Electron caustic lithography  

SciTech Connect

A maskless method of electron beam lithography is described which uses the reflection of an electron beam from an electrostatic mirror to produce caustics in the demagnified image projected onto a resist-coated wafer. By varying the electron optics, e.g. via objective lens defocus, both the morphology and dimensions of the caustic features may be controlled, producing a range of bright and tightly focused projected features. The method is illustrated for line and fold caustics and is complementary to other methods of reflective electron beam lithography.

Kennedy, S. M.; Zheng, C. X.; Tang, W. X.; Paganin, D. M.; Jesson, D. E. [School of Physics, Monash University, Victoria, 3800 (Australia); Fu, J. [Department of Mechanical and Aerospace Engineering, Monash University, Victoria, 3800 (Australia)

2012-06-15T23:59:59.000Z

360

Electron Beam Melting  

Science Conference Proceedings (OSTI)

Oct 9, 2012 ... Additive Manufacturing of Metals: Electron Beam Melting Program Organizers: Ian Harris, EWI; Ola Harrysson, North Carolina State University; ...

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


361

Free electron lasers  

SciTech Connect

A review of experimental and theoretical concepts of a free electron laser is given. The possibilities of scaling these lasers to high powers are discussed. (MOW)

Brau, C.A.

1980-01-01T23:59:59.000Z

362

Carbon Fiber Electronic Interconnects.  

E-Print Network (OSTI)

??Carbon fiber is an emerging material in electrical and electronics industry. It has been used as contact in many applications, such as switch, potentiometer, and… (more)

Deng, Yuliang

2007-01-01T23:59:59.000Z

363

Recycling Electronic Waste - Website  

Science Conference Proceedings (OSTI)

Jun 18, 2010 ... Joined: 2/13/2007. Below is a link to a website that has articles on recycling electronic waste. http://www.scientificamerican....ectronic-waste- ...

364

BNL | CFN: Electron Microscopy  

NLE Websites -- All DOE Office Websites (Extended Search)

and chemistry at the atomic scale is crucial to modern materials science and nanotechnology. Advanced electron microscopy can provide the fundamental knowledge that will...

365

ON THE MICROSCOPIC AND MACROSCOPIC ASPECTS OF NUCLEAR STRUCTURE WITH APPLICATIONS TO SUPERHEAVY NUCLEI  

SciTech Connect

The thesis is concerned with the relation between a microscopic approach and a macroscopic approach to the study of the nuclear binding energy as a function of neutron number, proton number and nuclear deformations. First of all we give a general discussion of the potential energy of a system which can be divided into a bulk region and a thin skin layer. We find that this energy can be written down in the usual liquid drop type of expression, i.e., in terms of the volume, the surface area and other macroscopic properties of the system. The discussion is illustrated by a study of noninteracting particles in an orthorhombic potential well with zero potential inside and infinite potential outside. The total energy is calculated both exactly (a microscopic approach) and also from a liquid drop type of expression (a macroscopic approach). It turns out that the latter approach reproduces the smooth average of the exact results very well. We next make a digression to study the saddle point shapes of a charged conducting drop on a pure liquid drop model. We compare the properties of a conducting drop with those of a drop whose charges are distributed uniformly throughout its volume. The latter is the usual model employed in the study of nuclear fission. We also determined some of the more important symmetric saddle point shapes. In the last part of the thesis we generalize a method due to Strutinski to synthesize a microscopic approach (the Nilsson model) and a macroscopic approach (the liquid drop model). The results are applied to realistic nuclei. The possible occurrence of shape isomers comes as a natural consequence of the present calculation. Their trends as a function of neutron and proton members are discussed and the results are tabulated. We also work out the stabilities of the predicted superheavy nuclei with proton number around 114 and neutron number around 184 and 196. Some of these nuclei appear to have extremely long life times. The possible experimental production of these superheavy nuclei are also discussed.

Tsang, Chin-Fu.

1969-05-22T23:59:59.000Z

366

Relativistic Brownian motion: From a microscopic binary collision model to the Langevin equation  

E-Print Network (OSTI)

The Langevin equation (LE) for the one-dimensional relativistic Brownian motion is derived from a microscopic collision model. The model assumes that a heavy point-like Brownian particle interacts with the lighter heat bath particles via elastic hard-core collisions. First, the commonly known, non-relativistic LE is deduced from this model, by taking into account the non-relativistic conservation laws for momentum and kinetic energy. Subsequently, this procedure is generalized to the relativistic case. There, it is found that the relativistic stochastic force is still $\\gd$-correlated (white noise) but does \\emph{no} longer correspond to a Gaussian white noise process. Explicit results for the friction and momentum-space diffusion coefficients are presented and discussed.

Jörn Dunkel; Peter Hänggi

2006-07-04T23:59:59.000Z

367

The effect of microscopic texture on the direct plasma surface passivation of Si solar cells  

SciTech Connect

Textured silicon surfaces are widely used in manufacturing of solar cells due to increasing the light absorption probability and also the antireflection properties. However, these Si surfaces have a high density of surface defects that need to be passivated. In this study, the effect of the microscopic surface texture on the plasma surface passivation of solar cells is investigated. The movement of 10{sup 5} H{sup +} ions in the texture-modified plasma sheath is studied by Monte Carlo numerical simulation. The hydrogen ions are driven by the combined electric field of the plasma sheath and the textured surface. The ion dynamics is simulated, and the relative ion distribution over the textured substrate is presented. This distribution can be used to interpret the quality of the Si dangling bonds saturation and consequently, the direct plasma surface passivation.

Mehrabian, S. [Laser and Plasma Research Institute, G.C., Shahid Beheshti University, Evin, Tehran 1983963113 (Iran, Islamic Republic of); Xu, S. [Plasma Sources and Applications Center, NIE, Nanyang Technological University, 637616 Singapore (Singapore); Qaemi, A. A. [Physics Department, G.C., Shahid Beheshti University, Evin, Tehran 1983963113 (Iran, Islamic Republic of); Shokri, B. [Laser and Plasma Research Institute, G.C., Shahid Beheshti University, Evin, Tehran 1983963113 (Iran, Islamic Republic of); Physics Department, G.C., Shahid Beheshti University, Evin, Tehran 1983963113 (Iran, Islamic Republic of); Chan, C. S. [Plasma Sources and Applications Center, NIE, Nanyang Technological University, 637616 Singapore (Singapore); Division of Microelectronics, School of EEE, Nanyang Technological University, 639798 Singapore (Singapore); Ostrikov, K. [Plasma Nanoscience Center Australia (PNCA), CSIRO Materials Science and Engineering, P.O. Box 218 Lindfield, NSW 2070 (Australia); Plasma Nanoscience, School of Physics, University of Sydney, Sydney, NSW 2006 (Australia); Institute for Superconducting and Electronic Materials (ISEM), University of Wollongong, NSW 2522 (Australia); School of Physics and Advanced Materials, University of Technology Sydney, Sydney, NSW 2006 (Australia); Plasma Sources and Applications Center, NIE, Nanyang Technological University, 637616 Singapore (Singapore)

2013-04-15T23:59:59.000Z

368

Search for microscopic black holes in pp collisions at sqrt(s) = 8 TeV  

E-Print Network (OSTI)

A search for microscopic black holes and string balls is presented, based on a data sample of pp collisions at sqrt(s) = 8 TeV recorded by the CMS experiment at the Large Hadron Collider and corresponding to an integrated luminosity of 12 inverse femtobarns. No excess of events with energetic multiparticle final states, typical of black hole production or of similar new physics processes, is observed. Given the agreement of the observations with the expected standard model background, which is dominated by QCD multijet production, 95% confidence limits are set on the production of semiclassical or quantum black holes, or of string balls, corresponding to the exclusions of masses below 4.3 to 6.2 TeV, depending on model assumptions. In addition, model-independent limits are set on new physics processes resulting in energetic multiparticle final states.

CMS Collaboration

2013-03-21T23:59:59.000Z

369

Microscopic Insights into the Electrochemical Behavior of Nonaqueous Electrolytes in Electric Double-Layer Capacitors  

Science Conference Proceedings (OSTI)

Electric double-layer capacitors (EDLCs) are electrical devices that store energy by adsorption of ionic species at the inner surface of porous electrodes. Compared with aqueous electrolytes, ionic liquid and organic electrolytes have the advantage of larger potential windows, making them attractive for the next generation of EDLCs with superior energy and power densities. The performance of both ionic liquid and organic electrolyte EDLCs hinges on the judicious selection of the electrode pore size and the electrolyte composition, which requires a comprehension of the charging behavior from a microscopic view. In this Perspective, we discuss predictions from the classical density functional theory (CDFT) on the dependence of the capacitance on the pore size for ionic liquid and organic electrolyte EDLCs. CDFT is applicable to electrodes with the pore size ranging from that below the ionic dimensionality to mesoscopic scales, thus unique for investigating the electrochemical behavior of the confined electrolytes for EDLC applications.

Jiang, Deen [ORNL; Wu, Jianzhong [University of California, Riverside

2013-01-01T23:59:59.000Z

370

Microscopic Insights into the Electrochemical Behavior of Non-aqueous Electrolytes in Supercapacitors  

Science Conference Proceedings (OSTI)

Electric double-layer capacitors (EDLC) are electrical devices that store energy by adsorption of ionic species at the inner surface of porous electrodes. Compared with aqueous electrolytes, ionic liquid and organic electrolytes have the advantage of larger potential windows, making them attractive for the next generation of EDLC with superior energy and power densities. The performance of both ionic liquid and organic electrolyte EDLC hinges on the judicious selection of the electrode pore size and the electrolyte composition that requires a comprehension of the charging behavior from a microscopic view. In this perspective, we discuss predictions from the classical density functional theory (CDFT) on the dependence of the capacitance on the pore size for ionic-liquid and organic-electrolyte EDLC. CDFT is applicable to electrodes with the pore size ranging from that below the ionic dimensionality to mesoscopic scales, thus unique for investigating the electrochemical behavior of the confined electrolytes for EDLC applications.

Jiang, Deen [ORNL; Wu, Jianzhong [ORNL

2013-01-01T23:59:59.000Z

371

Microscopic quantum structure of black hole and vacuum versus quantum statistical origin of gravity  

E-Print Network (OSTI)

The Planckon densely piled model of vacuum is proposed. Based on it, the microscopic quantum structure of Schwarzschild black hole and quantum statistical origin of its gravity are studied. It is shown that thermodynamic temperature equilibrium and mechanical acceleration balance make the space-time of the black hole horizon singular and Casimir effect works inside the horizon. This effect makes the inside vacuum have less zero fluctuation energy than the outside vacuum, and a temperature difference as well as gravity as thermal pressure are created. A dual relation between inside and outside regions of the black hole is found. By the dual relation, an attractor behaviour of the horizon surface is unveiled. Outside horizon, there exist thermodynamic non-equilibrium and mechanical non-balance which lead to outward centrifugal energy flow and inward gravitation energy flow, their compensation establishes local equilibrium. The lost vacuum energy in negative gravitation potential regions has been removed to the black hole surface to form a spherical Planckon shell with the thickness of Planckon diameter. All the particles absorbed by the black hole have fallen down to the horizon and converted into spin 1/2 radiation quanta made of standing waves on the horizon sphere with the mean energy related to Hawking-Unruh temperature, thermodynamic equilibrium and mechanical balance keep them stable and be tightly bound in the horizon. The gravitation mass 2M and physical mass $M$ of the black hole are calculated. The entropy of the black hole, calculated from the microscopic state number of the many-body system of radiation fermion quanta, is well consistent with Hawking. A radical modification of the temperature law of the black hole is made. The accelerating expansion of the universe yields the expansion cosmon and its energy density agrees with dark energy density.

Shun-Jin Wang

2012-12-24T23:59:59.000Z

372

A standard dose of radiation for microscopic disease is not appropriate  

SciTech Connect

Elective irradiation of sites of potential occult tumor spread is often part of a patient's radiation therapy program. The required radiation dose (D) depends on the probability that occult disease exists (P(occ)), the number of sites at risk (A), the number of tumor clonogens present (Ni), their radiation sensitivity, and the desired control rate. An exponential model of cell survival is used to quantify the importance of these factors. Control Probability = (1 - Pocc x (1 - e-Ni x (SF2)D/2))A; SF2 = surviving fraction after 2 Gy. Implications for clinical radiation therapy include: 1. Since the number of clonogens in an occult site may vary from 10 degrees to 10(8), Ni is the major determinant of the required dose. The intrinsic radiation sensitivity of the clonogens (SF2) is also extremely important in determining the dose. Other factors are less influential since they vary less. 2. The variability of Ni (8 logs) is larger than the variation in cell number seen with gross disease (1 cm3 versus 1000 cm3, 3 logs). When Ni approximately 10(8), the required dose approaches that needed for small volume gross disease (10(9) cells, 1 cm3). 3. The dose prescribed to elective sites should reflect the risk of occult disease based on the primary tumor site, stage, and grade. 4. Regions where clinicoradiologic evaluation is difficult (e.g., pelvis and obese neck) require higher doses because macroscopic tumor deposits may exist. 5. Relatively low doses (10 to 30 Gy) are often thought to be inadequate for microscopic tumor. However, similar doses have been reported to sterilize microscopic tumor in ovarian, rectal, bladder, breast, and head and neck carcinomas. Relatively low doses should not be discounted since they may be useful in select cases when normal tissue tolerances and/or previous irradiation treatment limit the radiation dose.

Marks, L.B. (Duke Univ. Medical Center, Durham, NC (USA))

1990-12-15T23:59:59.000Z

373

The r-Process in Supernovae: Impact of New Microscopic Mass Formulas  

E-Print Network (OSTI)

The astrophysical origin of $r$-process nuclei remains a long-standing mystery. Although some astrophysical scenarios show some promise, many uncertainties involved in both the astrophysical conditions and in the nuclear properties far from the $\\beta$-stability have inhibited us from understanding the nature of the $r$-process. The purpose of the present paper is to examine the effects of the newly-derived microscopic Hartree-Fock-Bogoliubov (HFB) mass formulas on the $r$-process nucleosynthesis and analyse to what extent a solar-like $r$-abundance distribution can be obtained. The $r$-process calculations with the HFB-2 mass formula are performed, adopting the parametrized model of the prompt explosion from a collapsing O-Ne-Mg core for the physical conditions and compared with the results obtained with the HFB-7 and droplet-type mass formulas. Due to its weak shell effect at the neutron magic numbers in the neutron-rich region, the microscopic mass formulas (HFB-2 and HFB-7) give rise to a spread of the abundance distribution in the vicinity of the $r$-process peaks ($A = 130$ and 195). While this effect resolves the large underproduction at $A \\approx 115$ and 140 obtained with droplet-type mass formulas, large deviations compared to the solar pattern are found near the third $r$-process peak. It is shown that a solar-like $r$-process pattern can be obtained if the dynamical timescales of the outgoing mass trajectories are increased by a factor of about 2-3, or if the $\\beta$-decay rates are systematically increased by the same factor.

Shinya Wanajo; Stephane Goriely; Mathieu Samyn; Naoki Itoh

2004-01-21T23:59:59.000Z

374

Microscopic models and effective equation of state in nuclear collisions at FAIR energies  

E-Print Network (OSTI)

Two microscopic models, UrQMD and QGSM, were employed to study the formation of locally equilibrated hot and dense nuclear matter in heavy-ion collisions at energies from 11.6 AGeV to 160 AGeV. Analysis was performed for the fixed central cubic cell of volume V = 125 fm**3 and for the expanding cell which followed the growth of the central area with uniformly distributed energy. To decide whether or not the equilibrium was reached, results of the microscopic calculations were compared to that of the statistical thermal model. Both dynamical models indicate that the state of kinetic, thermal and chemical equilibrium is nearly approached at any bombarding energy after a certain relaxation period. The higher the energy, the shorter the relaxation time. Equation of state has a simple linear dependence P = a(sqrt{s})*e, where a = c_s**2 is the sound velocity squared. It varies from 0.12 \\pm 0.01 at E_{lab} = 11.6 AGeV to 0.145 \\pm 0.005 at E_{lab} = 160 AGeV. Change of the slope in a(sqrt{s}) behavior occurs at E_{lab} = 40 AGeV and can be assigned to the transition from baryon-rich to meson-dominated matter. The phase diagrams in the T - mu_B plane show the presence of kinks along the lines of constant entropy per baryon. These kinks are linked to the inelastic (i.e. chemical) freeze-out in the system.

L. Bravina; I. Arsene; J. Bleibel; M. Bleicher; G. Burau; Amand Faessler; C. Fuchs; M. S. Nilsson; H. Stoecker; K. Tywoniuk; E. Zabrodin

2008-04-09T23:59:59.000Z

375

Controlling Graphene's Electronic Structure  

NLE Websites -- All DOE Office Websites (Extended Search)

Controlling Graphene's Electronic Structure Print Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's electrical charge carriers (electrons and holes) move through a solid with effectively zero mass and constant velocity, like photons. Graphene's intrinsically low scattering rate from defects implies the possibility of a new kind of electronics based on the manipulation of electrons as waves rather than particles. The primary technical difficulty has been controlling the transport of electrical charge carriers through the sheet. This area of research is known as bandgap engineering. While bandgap engineering is the basis of semiconductor technology, it is only now being applied to graphene. Using angle-resolved photoemission spectroscopy (ARPES) at ALS Beamline 7.0.1, a team of scientists from the ALS and Germany characterized the electronic band structure and successfully controlled the gap between valence and conduction bands in a bilayer of graphene thin films deposited on a substrate of silicon carbide. This was done by doping one sheet with adsorbed potassium atoms, creating an asymmetry between the two layers.

376

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors  

NLE Websites -- All DOE Office Websites (Extended Search)

Electronic Structure and Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print Wednesday, 29 November 2006 00:00 The possibility of using electrons' spins in addition to their charge in information technology has created much enthusiasm for a new field of electronics popularly known as "spintronics." An intensely studied approach to obtaining spin-polarized carriers for data-storage devices is the use of diluted magnetic semiconductors created by doping ions like Mn, Fe, or Co having a net spin into a semiconducting host such as GaAs, ZnO, or GaN. The interaction among these spins leads to ferromagnetic order at low temperatures, which is necessary to create spin-polarized carriers. A research team working at ALS Beamline 4.0.2 and European Synchrotron Radiation Facility Beamline ID8 made a big leap forward in clarifying the microscopic picture of magnetism and anisotropy in Mn-doped GaAs by resolving localized and hybridized d states using angle-dependent x-ray magnetic circular dichroism (XMCD) measurements.

377

Vibration-Assisted Electron Tunneling in C140 Transistors  

E-Print Network (OSTI)

We measure electron tunneling in transistors made from C140, a molecule with a mass?spring?mass geometry chosen as a model system to study electron-vibration coupling. We observe vibration-assisted tunneling at an energy corresponding to the stretching mode of C140. Molecular modeling provides explanations for why this mode couples more strongly to electron tunneling than to the other internal modes of the molecule. We make comparisons between the observed tunneling rates and those expected from the Franck?Condon model. When electrons travel through molecules, vibrational modes of the molecules can affect current flow. Molecular-vibrationassisted tunneling was first measured in the 1960s using devices whose tunnel barriers contained many molecules. 1 Recently, effects of vibrations in single molecules have been measured using scanning tunneling microscopes, 2 singlemolecule transistors, 3,4 and mechanical break junctions. 5 Theoretical considerations suggest that different regimes may exist depending on whether tunneling electrons occupy resonant energy levels on the molecule, and also on the * Corresponding author.

A. N. Pasupathy; J. Park; C. Chang; A. V. Soldatov; S. Lebedkin; R. C. Bialczak; J. E. Grose; L. A. K. Donev; J. P. Sethna; D. C. Ralph; P. L. Mceuen

2004-01-01T23:59:59.000Z

378

Electronic Reading Room  

NLE Websites -- All DOE Office Websites (Extended Search)

Electronic Reading Room - making information about the Freedom of Information Act (FOIA) and Privacy Act process accessible to the public electronically. Electronic Reading Room - making information about the Freedom of Information Act (FOIA) and Privacy Act process accessible to the public electronically. Major Information Systems - Final Opinions - [5 USC 552 (a)(2)](A) final opinions, including concurring and dissenting opinions, as well as orders, made in the adjudication of cases within the Office of Hearings and Appeals Statements of Policy and Interpretation and Administrative Staff Manuals and Instructions - [5 USC 552 (a)(2)](B) those statements of policy and interpretation which have been adopted by the agency and are not published in the Federal Register - Directives, DOE Orders, Headquarters Orders, Secretarial Notices, Technical Standards, Forms, Delegations, Electronic Library Public Reading Facilities - making information available for public inspection and copying

379

Electron: Cluster interactions  

SciTech Connect

Beam depletion spectroscopy has been used to measure absolute total inelastic electron-sodium cluster collision cross sections in the energy range from E {approximately} 0.1 to E {approximately} 6 eV. The investigation focused on the closed shell clusters Na{sub 8}, Na{sub 20}, Na{sub 40}. The measured cross sections show an increase for the lowest collision energies where electron attachment is the primary scattering channel. The electron attachment cross section can be understood in terms of Langevin scattering, connecting this measurement with the polarizability of the cluster. For energies above the dissociation energy the measured electron-cluster cross section is energy independent, thus defining an electron-cluster interaction range. This interaction range increases with the cluster size.

Scheidemann, A.A. [Washington Univ., Seattle, WA (United States). Dept. of Chemistry; Kresin, V.V. [Lawrence Livermore National Lab., CA (United States); Knight, W.D. [California Univ., Berkeley, CA (United States). Dept. of Physics

1994-02-01T23:59:59.000Z

380

Electrons and Mirror Symmetry  

SciTech Connect

The neutral weak force between an electron and a target particle, mediated by the Z boson, can be isolated by measuring the fractional change under a mirror reflection of the scattering probability of relativistic longitudinally polarized electrons off unpolarized targets. This technique yields neutral weak force measurements at a length scale of 1 femtometer, in contrast to high energy collider measurements that probe much smaller length scales. Study of the variation of the weak force over a range of length scales provides a stringent test of theory, complementing collider measurements. We describe a recent measurement of the neutral weak force between two electrons by the E158 experiment at the Stanford Linear Accelerator Center. While the weak force between an electron and positron has been extensively studied, that between two electrons had never directly been measured. We conclude by discussing prospects for even more precise measurements at future facilities.

Kumar, Krishna (University of Massachusetts, Amherst)

2007-04-04T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


381

Developing electronic textbooks  

SciTech Connect

This paper discusses a new approach to the development of engineering education materials. The ``Electronic Textbook`` represents the logical progression of the printed textbook in the Electronic Age. The concept behind this approach is simple; to place all of the information contained in a textbook in electronic form. Currently, paper texts exist on the market with electronic supplements, however, this Electronic Textbook would include supplements fully integrated in the whole text. The computer hardware and software needed to make this advance possible have existed for nearly ten years, and they have been readily available to engineering educators and students for over three years. Computer based ``tools`` in engineering textbooks as are prevalent today range from computer styled algorithms and code snippets, to fully developed software applications with graphical user interfaces on floppy disks attached to the back covers of books. The next logical step in publishing is to dispense with the paper book entirely, by distributing textbooks via electronic media such as CD-ROM. Electronic Textbooks use the full range of multi-media technologies in the learning and teaching process including video clips, computer animations and fully functional numerical engines as integral parts of the textbook material. This is very appealing since interactive media provide teaching tools that appeal to divergent learning styles. The advantages of Electronic Textbooks lead to several challenges. Special attention must be paid to the development of user interfaces; navigation is of particular importance when non- linear exploration is encouraged. These issues are being addressed at the Sandia National Laboratories by an electronic documentation development team. This team includes experts in engineering, in human factors, and in computer hardware and software development. Guidelines for the development of electronic textbooks based on the experiences of this team are provided.

Zadoks, R.I. [Texas Univ., El Paso, TX (United States). Mechanical and Industrial Engineering Dept.; Ratner, J.A. [Sandia National Labs., Albuquerque, NM (United States)

1996-03-01T23:59:59.000Z

382

Nano-electron beam induced current and hole charge dynamics through uncapped Ge nanocrystals  

Science Conference Proceedings (OSTI)

Dynamics of hole storage in spherical Ge nanocrystals (NCs) formed by a two step dewetting/nucleation process on an oxide layer grown on an n-doped silicon substrate is studied using a nano-electron beam induced current technique. Carrier generation is produced by an electron beam irradiation. The generated current is collected by an atomic force microscope--tip in contact mode at a fixed position away from the beam spot of about 0.5 {mu}m. This distance represents the effective diffusion length of holes. The time constants of holes charging are determined and the effect of the NC size is underlined.

Marchand, A.; El Hdiy, A.; Troyon, M. [Laboratoire de Recherche en Nanosciences, Bat. 6, case no 15, UFR Sciences, Universite de Reims Champagne Ardenne, 51687 Reims Cedex 2 (France); Amiard, G.; Ronda, A.; Berbezier, I. [IM2NP, Faculte des Sciences et Techniques, Campus de Saint Jerome - Case 142, Avenue Escadrille Normandie Niemen, 13397 Marseille Cedex 20 (France)

2012-04-16T23:59:59.000Z

383

Superconducting qubit as a quantum transformer routing entanglement between a microscopic quantum memory and a macroscopic resonator  

Science Conference Proceedings (OSTI)

We demonstrate experimentally the creation and measurement of an entangled state between a microscopic two-level system (TLS), formed by a defect in an oxide layer, and a macroscopic superconducting resonator, where their indirect interaction is mediated by an artificial atom, a superconducting persistent current qubit (PCQB). Under appropriate conditions, we found the coherence time of the TLS, the resonator, and the entangled state of these two are significantly longer than the Ramsey dephasing time of PCQB itself. This demonstrates that a PCQB can be used as a quantum transformer to address high coherence microscopic quantum memories by connecting them to macroscopic quantum buses.

Kemp, Alexander; Saito, Shiro; Semba, Kouichi [NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya Atsugi-shi, Kanagawa 243-0198 (Japan); Munro, William J. [NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya Atsugi-shi, Kanagawa 243-0198 (Japan); National Institute of Informatics 2-1-2 Hitotsubashi, Chiyoda ku, Tokyo 101-8430 (Japan); Nemoto, Kae [National Institute of Informatics 2-1-2 Hitotsubashi, Chiyoda ku, Tokyo 101-8430 (Japan)

2011-09-01T23:59:59.000Z

384

Aerogels for electronics  

SciTech Connect

In addition to their other exceptional properties, aerogels also exhibit unusual dielectric and electronic properties due to their nano-sized structures and high porosities. For example, aerogels have the lowest dielectric constants measured for a solid material (having values approaching 1.0); they have exceptionally high dielectric resistivities and strengths (i.e., ability to insulate very high voltages); they exhibit low dielectric loss at microwave frequencies; and some aerogels are electrically conductive and photoconductive. These properties are being exploited to provide the next generation of materials for energy storage, low power consumption, and ultra-fast electronics. We are working toward adapting these unusual materials for microelectronic applications, particularly, making thin aerogel films for dielectric substrates and for energy storage devices such as supercapacitors. Measurements are presented in this paper for the dielectric and electronic properties of aerogels, including the dielectric constant, loss factor, dielectric and electrical conductivity, volume resistivity, and dielectric strength. We also describe methods to form and characterize thin aerogel films which are being developed for numerous electronic applications. Finally, some of the electronic applications proposed for aerogels are presented. Commercialization of aerogels for electronics must await further feasibility, prototype development, and cost studies, but they are one of the key materials and are sure to have a major impact on future electronics.

Hrubesh, L.W.

1994-10-01T23:59:59.000Z

385

Transmission Electron Microscopy (TEM)  

Science Conference Proceedings (OSTI)

...Transmission electron microcopy (TEM) has been used since the 1950s to obtain very high resolution images of microstructures. As TEMs were enhanced to include features such as digitally scanned point beams and energy dispersive x-ray detectors

386

What is flexible electronics?  

Science Conference Proceedings (OSTI)

Flexible electronics has recently attracted much attention because of their potential in providing cost-efficient solutions to large-area applications such as rollable displays and TVs, e-paper, smart sensors and transparent RFIDs. The key advantages ...

Kwang-Ting (Tim) Cheng; Tsung-Ching Huang

2009-04-01T23:59:59.000Z

387

WETTABILITY AND IMBIBITION: MICROSCOPIC DISTRIBUTION OF WETTING AND ITS CONSEQUENCES AT THE CORE AND FIELD SCALES  

SciTech Connect

The questions of reservoir wettability have been approached in this project from three directions. First, we have studied the properties of crude oils that contribute to wetting alteration in a reservoir. A database of more than 150 different crude oil samples has been established to facilitate examination of the relationships between crude oil chemical and physical properties and their influence on reservoir wetting. In the course of this work an improved SARA analysis technique was developed and major advances were made in understanding asphaltene stability including development of a thermodynamic Asphaltene Solubility Model (ASM) and empirical methods for predicting the onset of instability. The CO-Wet database is a resource that will be used to guide wettability research in the future. The second approach is to study crude oil/brine/rock interactions on smooth surfaces. Contact angle measurements were made under controlled conditions on mica surfaces that had been exposed to many of the oils in the CO-Wet database. With this wealth of data, statistical tests can now be used to examine the relationships between crude oil properties and the tendencies of those oils to alter wetting. Traditionally, contact angles have been used as the primary wetting assessment tool on smooth surfaces. A new technique has been developed using an atomic forces microscope that adds a new dimension to the ability to characterize oil-treated surfaces. Ultimately we aim to understand wetting in porous media, the focus of the third approach taken in this project. Using oils from the CO-Wet database, experimental advances have been made in scaling the rate of imbibition, a sensitive measure of core wetting. Application of the scaling group to mixed-wet systems has been demonstrated for a range of core conditions. Investigations of imbibition in gas/liquid systems provided the motivation for theoretical advances as well. As a result of this project we have many new tools for studying wetting at microscopic and macroscopic scales and a library of well-characterized fluids for use in studies of crude oil/brine/rock interactions.

Jill S. Buckley; Norman R. Morrow; Chris Palmer; Purnendu K. Dasgupta

2003-02-01T23:59:59.000Z

388

Free electron laser  

DOE Patents (OSTI)

A high gain, single-pass free electron laser formed of a high brilliance electron injector source, a linear accelerator which imparts high energy to the electron beam, and an undulator capable of extremely high magnetic fields, yet with a very short period. The electron injector source is the first stage (gap) of the linear accelerator or a radial line transformer driven by fast circular switch. The linear accelerator is formed of a plurality of accelerating gaps arranged in series. These gaps are energized in sequence by releasing a single pulse of energy which propagates simultaneously along a plurality of transmission lines, each of which feeds the gaps. The transmission lines are graduated in length so that pulse power is present at each gap as the accelerated electrons pass therethrough. The transmission lines for each gap are open circuited at their ends. The undualtor has a structure similar to the accelerator, except that the transmission lines for each gap are substantially short circuited at their ends, thus converting the electric field into magnetic field. A small amount of resistance is retained in order to generate a small electric field for replenishing the electron bunch with the energy lost as it traverses through the undulator structure.

Villa, Francesco (Alameda, CA)

1990-01-01T23:59:59.000Z

389

Markov Random Field Based Automatic Image Alignment for ElectronTomography  

SciTech Connect

Cryo electron tomography (cryo-ET) is the primary method for obtaining 3D reconstructions of intact bacteria, viruses, and complex molecular machines ([7],[2]). It first flash freezes a specimen in a thin layer of ice, and then rotates the ice sheet in a transmission electron microscope (TEM) recording images of different projections through the sample. The resulting images are aligned and then back projected to form the desired 3-D model. The typical resolution of biological electron microscope is on the order of 1 nm per pixel which means that small imprecision in the microscope's stage or lenses can cause large alignment errors. To enable a high precision alignment, biologists add a small number of spherical gold beads to the sample before it is frozen. These beads generate high contrast dots in the image that can be tracked across projections. Each gold bead can be seen as a marker with a fixed location in 3D, which provides the reference points to bring all the images to a common frame as in the classical structure from motion problem. A high accuracy alignment is critical to obtain a high resolution tomogram (usually on the order of 5-15nm resolution). While some methods try to automate the task of tracking markers and aligning the images ([8],[4]), they require user intervention if the SNR of the image becomes too low. Unfortunately, cryogenic electron tomography (or cryo-ET) often has poor SNR, since the samples are relatively thick (for TEM) and the restricted electron dose usually results in projections with SNR under 0 dB. This paper shows that formulating this problem as a most-likely estimation task yields an approach that is able to automatically align with high precision cryo-ET datasets using inference in graphical models. This approach has been packaged into a publicly available software called RAPTOR-Robust Alignment and Projection estimation for Tomographic Reconstruction.

Moussavi, Farshid; Amat, Fernando; Comolli, Luis R.; Elidan, Gal; Downing, Kenneth H.; Horowitz, Mark

2007-11-30T23:59:59.000Z

390

Microscopic Approach to Analyze Solar-Sail Space-Environment Effects  

E-Print Network (OSTI)

Near-sun space-environment effects on metallic thin films solar sails as well as hollow-body sails with inflation fill gas are considered. Analysis of interaction of the solar radiation with the solar sail materials is presented. This analysis evaluates worst-case solar radiation effects during solar-radiation-pressure acceleration. The dependence of the thickness of solar sail on temperature and on wavelength of the electromagnetic spectrum of solar radiation is investigated. Physical processes of the interaction of photons, electrons, protons and helium nuclei with sail material atoms and nuclei, and inflation fill gas molecules are analyzed. Calculations utilized conservative assumptions with the highest values for the available cross sections for interactions of solar photons, electrons and protons with atoms, nuclei and hydrogen molecules. It is shown that for high-energy photons, electrons and protons the beryllium sail is mostly transparent. Sail material will be partially ionized by solar UV and low-e...

Kezerashvili, Roman Ya

2009-01-01T23:59:59.000Z

391

2003The Royal Microscopical Society Journal of Microscopy,Vol. 212, Pt 3 December 2003, pp. 254263  

E-Print Network (OSTI)

, The Netherlands Key words. Bioluminescence measurements, embedded instrumentation, fluorescence measurements fluid volume per well in real-time, and for monitoring the fluorescence associated with the production in ATP assays). We show that our detection limit for NADH fluorescence is 5 µm with a microscope

van Vliet, Lucas J.

392

Precision shape modification of nanodevices with a low-energy electron beam  

DOE Patents (OSTI)

Methods of shape modifying a nanodevice by contacting it with a low-energy focused electron beam are disclosed here. In one embodiment, a nanodevice may be permanently reformed to a different geometry through an application of a deforming force and a low-energy focused electron beam. With the addition of an assist gas, material may be removed from the nanodevice through application of the low-energy focused electron beam. The independent methods of shape modification and material removal may be used either individually or simultaneously. Precision cuts with accuracies as high as 10 nm may be achieved through the use of precision low-energy Scanning Electron Microscope scan beams. These methods may be used in an automated system to produce nanodevices of very precise dimensions. These methods may be used to produce nanodevices of carbon-based, silicon-based, or other compositions by varying the assist gas.

Zettl, Alex (Kensington, CA); Yuzvinsky, Thomas David (Berkeley, CA); Fennimore, Adam (Berkeley, CA)

2010-03-09T23:59:59.000Z

393

Acceleration of non-relativistic electrons at a dielectric grating structure: Status report  

Science Conference Proceedings (OSTI)

We report on an experiment aiming at a proof-of-concept of a non-relativistic direct laser accelerator. The system is based on a fused-silica transmission grating illuminated by Titanium:sapphire femtosecond pulses in order to excite evanescent spatial modes, which propagate synchronously with 28 keV electrons originating from an electron column of a scanning electron microscope. The grating period is 750 nm, and we use the third spatial harmonic to continuously accelerate the non-relativistic electrons. With a laser pulse energy of about 150 nJ numerical simulations show expected accelerating gradients of up to 60 MeV/m and an energy gain of around 300 eV at a distance of 100 nm away from the grating surface. The current status of the experiment is reported.

Breuer, John; Hommelhoff, Peter [Max Planck Institute of Quantum Optics, Hans-Kopfermann-Str. 1, 85748 Garching (Germany)

2012-12-21T23:59:59.000Z

394

Low energy electron beam induced vacancy activation in GaN  

Science Conference Proceedings (OSTI)

Experimental evidence on low energy electron beam induced point defect activation in GaN grown by metal-organic vapor phase epitaxy (MOVPE) is presented. The GaN samples are irradiated with a 5-20 keV electron beam of a scanning electron microscope and investigated by photoluminescence and positron annihilation spectroscopy measurements. The degradation of the band-to-band luminescence of the irradiated GaN films is associated with the activation of point defects. The activated defects were identified as in-grown Ga-vacancies. We propose that MOVPE-GaN contains a significant concentration of passive V{sub Ga}-H{sub n} complexes that can be activated by H removal during low energy electron irradiation.

Nykaenen, H.; Suihkonen, S.; Sopanen, M. [Department of Micro- and Nanosciences, Aalto University, P.O. Box 13500, FI-00076 Aalto (Finland); Kilanski, L. [Department of Applied Physics, Aalto University, P.O. Box 11100, FI-00076 Aalto (Finland); Institute of Physics, Polish Academy of Sciences, Al. Lotnikow 32/56, 02-668 Warsaw (Poland); Tuomisto, F. [Department of Applied Physics, Aalto University, P.O. Box 11100, FI-00076 Aalto (Finland)

2012-03-19T23:59:59.000Z

395

Electron and laser beam welding  

SciTech Connect

This book contains 22 selections. Some of the titles are: Laser welding of chandelles to the plates of the sommier employed in the nuclear power plant core; Electron beam welding of hobbing cutters; Sealing welds in electron beam welding of thick metals; Development and application of high power electron beam welding; Electron beam welding of dissimilar metals (niobium, molybdenum, porous tungsten-molybdenum); Status of electron beam welding in the United States of America; and Electron and laser beam welding in Japan.

1986-01-01T23:59:59.000Z

396

Scientists combine X-rays and microscopes for precise experiments | Argonne  

NLE Websites -- All DOE Office Websites (Extended Search)

This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. Scientists combine X-rays and microscopes for precise experiments

397

Microscopic mechanism of charged-particle radioactivity and generalization of the Geiger-Nuttall law  

Science Conference Proceedings (OSTI)

A linear relation for charged-particle emissions is presented starting from the microscopic mechanism of the radioactive decay. It relates the logarithms of the decay half-lives with two variables, called {chi}{sup '} and {rho}{sup '}, which depend upon the Q values of the outgoing clusters as well as the masses and charges of the nuclei involved in the decay. This relation explains well all known cluster decays. It is found to be a generalization of the Geiger-Nuttall law in {alpha} radioactivity, and therefore we call it the universal decay law. Predictions of the most likely emissions of various clusters are presented by applying the law over the whole nuclear chart. It is seen that the decays of heavier clusters with nonequal proton and neutron numbers are mostly located in the trans-lead region. The emissions of clusters with equal protons and neutrons, like {sup 12}C and {sup 16}O, are possible in some neutron-deficient nuclei with Z{>=}54.

Qi, C. [School of Physics, and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China); KTH - Royal Institute of Technology, Alba Nova University Center, SE-10691 Stockholm (Sweden); Xu, F. R. [School of Physics, and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China); Center for Theoretical Nuclear Physics, National Laboratory for Heavy Ion Physics, Lanzhou 730000 (China); Liotta, R. J.; Wyss, R. [KTH - Royal Institute of Technology, Alba Nova University Center, SE-10691 Stockholm (Sweden); Zhang, M. Y.; Asawatangtrakuldee, C.; Hu, D. [School of Physics, and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China)

2009-10-15T23:59:59.000Z

398

A high-pressure atomic force microscope for imaging in supercritical carbon dioxide  

Science Conference Proceedings (OSTI)

A high-pressure atomic force microscope (AFM) that enables in situ, atomic scale measurements of topography of solid surfaces in contact with supercritical CO{sub 2} (scCO{sub 2}) fluids has been developed. This apparatus overcomes the pressure limitations of the hydrothermal AFM and is designed to handle pressures up to 100 atm at temperatures up to ?350 K. A standard optically-based cantilever deflection detection system was chosen. When imaging in compressible supercritical fluids such as scCO{sub 2} , precise control of pressure and temperature in the fluid cell is the primary technical challenge. Noise levels and imaging resolution depend on minimization of fluid density fluctuations that change the fluid refractive index and hence the laser path. We demonstrate with our apparatus in situ atomic scale imaging of a calcite (CaCO{sub 3}) mineral surface in scCO{sub 2}; both single, monatomic steps and dynamic processes occurring on the (10{overbar 1}4) surface are presented. This new AFM provides unprecedented in situ access to interfacial phenomena at solid–fluid interfaces under pressure.

Lea, A.S.; Higgins, S.R.; Knauss, K.G.; Rosso, K.M.

2011-01-15T23:59:59.000Z

399

A high-pressure atomic force microscope for imaging in supercritical carbon dioxide  

Science Conference Proceedings (OSTI)

A high-pressure atomic force microscope (AFM) that enables in-situ, atomic scale measurements of topography of solid surfaces in contact with supercritical CO2 (scCO2) fluids has been developed. This apparatus overcomes the pressure limitations of the hydrothermal AFM and is designed to handle pressures up to 100 atm at temperatures up to ~ 350 K. A standard optically-based cantilever deflection detection system was chosen. When imaging in compressible supercritical fluids such as scCO2, precise control of pressure and temperature in the fluid cell is the primary technical challenge. Noise levels and imaging resolution depend on minimization of fluid density fluctuations that change the fluid refractive index and hence the laser path. We demonstrate with our apparatus in-situ atomic scale imaging of a calcite (CaCO3) mineral surface in scCO2; both single, monatomic steps and dynamic processes occurring on the (10¯14) surface are presented. This new AFM provides unprecedented in-situ access to interfacial phenomena at solid-fluid interfaces under pressure.

Lea, Alan S.; Higgins, Steven R.; Knauss, Kevin G.; Rosso, Kevin M.

2011-04-26T23:59:59.000Z

400

Microcanonical Thermostatistics as Foundation of Thermodynamics. The microscopic origin of condensation and phase separations  

E-Print Network (OSTI)

Conventional thermo-statistics address infinite homogeneous systems within the canonical ensemble. However, some 150 years ago the original motivation of thermodynamics was the description of steam engines, i.e. boiling water. Its essential physics is the separation of the gas phase from the liquid. Of course, boiling water is inhomogeneous and as such cannot be treated by canonical thermo-statistics. Then it is not astonishing, that a phase transition of first order is signaled canonically by a Yang-Lee singularity. Thus it is only treated correctly by microcanonical Boltzmann-Planck statistics. This is elaborated in the present article. It turns out that the Boltzmann-Planck statistics is much richer and gives fundamental insight into statistical mechanics and especially into entropy. This can even be done to some extend rigorously and analytically. The microcanonical entropy has a very simple physical meaning: It measures the microscopic uncertainty that we have about the system, i.e. the number of points in $6N$-dim phase, which are consistent with our information about the system. It can rigorously be split into an ideal-gas part and a configuration part which contains all the physics and especially is responsible for all phase transitions. The deep and essential difference between ``extensive'' and ``intensive'' control parameters, i.e. microcanonical and canonical statistics, is exemplified by rotating, self-gravitating systems.

D. H. E. Gross

2004-11-16T23:59:59.000Z

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401

Generalized microscopic theory of ion selectivity in voltage-gated ion channels  

E-Print Network (OSTI)

Ion channels are specific proteins present in the membranes of living cells. They control the flow of specific ions through a cell, initiated by an ion channel's electrochemical gradient. In doing so, they control important physiological processes such as muscle contraction and neuronal connectivity, which cannot be properly activated if these channels go haywire, leading to life-threatening diseases and psychological disorders. Here, we will develop a generalized microscopic theory of ion selectivity applicable to KcsA, Na$_{\\rm v}$Rh and Ca$_{\\rm v}$ (L-type) ion channels. We unambiguously expose why and how a given ion-channel can be highly selective, and yet has a conductance of the order of one million ions per second, or higher. We will identify and prove the correct physico-biochemical mechanisms that are responsible for the high selectivity of a particular ion in a given ion channel. The above mechanisms consist of five conditions, which can be directly associated to these parameters - (i) dehydration energy, (ii) concentration of the "correct" ions (iii) Coulomb-van-der-Waals attraction, (iv) pore and ionic sizes, and indirectly to (v) the thermodynamic stability and (vi) the "knock-on" assisted permeation.

Andrew Das Arulsamy

2012-09-12T23:59:59.000Z

402

Evidence for the microscopic formation of mixed-symmetry states from magnetic moment measurements  

SciTech Connect

Using the transient field technique, the magnetic moments of the second excited 2{sup +} states in {sup 92,94}Zr have been measured for the first time. The large positive g factors, g(2{sub 2}{sup +};{sup 92}Zr)=+0.76(50) and g(2{sub 2}{sup +};{sup 94}Zr)=+0.88(27), which are in contrast to the known negative g factors of the 2{sub 1}{sup +} states, are found to be a consequence of weak proton-neutron coupling combined with the Z=40 subshell closure. From their large M1 transition strengths to the 2{sub 1}{sup +} states, in earlier works an assignment to the 2{sub 2}{sup +} states as proton-neutron symmetric and mixed-symmetry states has been made, which are now found to be polarized in their proton-neutron content. This fact allows to identify the underlying microscopic main configurations in the wave functions, which form the building blocks of symmetric and mixed-symmetry states in this region as valence nucleons are added and shell structure changes.

Werner, V.; Ai, H.; Casperson, R. J.; Casten, R. F.; Eckel, S.; Heinz, A.; Lambie-Hanson, C.; McCutchan, E. A.; Meyer, D. A.; Qian, J.; Schmidt, A.; Williams, E.; Winkler, R. [Wright Nuclear Structure Laboratory, Yale University, New Haven, Connecticut 06520-8124 (United States); Benczer-Koller, N.; Kumbartzki, G.; Boutachkov, P. [Department of Physics and Astronomy, Rutgers University, New Brunswick, New Jersey 08903 (United States); Holt, J. D. [TRIUMF, Vancouver (Canada); Stefanova, E. [Department of Physics and Astronomy, Rutgers University, New Brunswick, New Jersey 08903 (United States); Institute for Nuclear Research and Nuclear Energy, BAS, 1784 Sofia (Bulgaria); Perry, M. [Wright Nuclear Structure Laboratory, Yale University, New Haven, Connecticut 06520-8124 (United States); Department of Physics, Florida State University, Florida (United States); Pietralla, N. [Institut fuer Kernphysik, TU Darmstadt, D-64289 Darmstadt (Germany)] (and others)

2008-09-15T23:59:59.000Z

403

Microscopic description of isoscalar giant resonance excitations in ??Ca and ¹¹?SN nuclei  

E-Print Network (OSTI)

This thesis presents a microscopic description of isoscalar giant resonance excitations in ??Ca and ¹¹? Sn nuclei within the self-consistent Skyrme-Hartree-Fock-Random-Phase-Approximation (HF-RPA) theory. Such characteristic features of the Isoscalar Giant Resonance as strength function, transition density and cross-sections for ??Ca and ¹¹?Sn nuclei are obtained. In this analysis, the SL1 Skyrme interaction associated with 230 MeV for the value of nuclear matter incompressibility coefficient K is chosen. The selection of nuclei is based on the availability of recent experimental results from Texas A&M University. The coordinate space formulation of the RPA in terms of Green's function is employed to obtain isoscalar monopole and dipole transition strength distributions for ??Ca and ¹¹?Sn nuclei. Calculations are performed with the discretized single-particle continuum. Theoretical transition strength distributions are used to find quantities of interest such as energy positions of resonance states, sum rules and average resonance energies. The cross-section of 240 MeV ?-particle scattering on the above nuclei are analysed within the Distorted Wave Born Approximation (DWBA) using transition densities obtained from the HF-RPA calculations. From this analysis the cross-sections for ISGDR excitations are obtained and compared with the recent experimental data obtained at the Cyclotron Institute, Texas A&M University.

Karki, Bhishma

2000-01-01T23:59:59.000Z

404

Microscopic Description of Entanglements in Polyethylene Networks and Melts: Strong, Weak, Pairwise, and Collective Attributes  

E-Print Network (OSTI)

We present atomistic molecular dynamics simulations of two Polyethylene systems where all entanglements are trapped: a perfect network, and a melt with grafted chain ends. We examine microscopically at what level topological constraints can be considered as a collective entanglement effect, as in tube model theories, or as certain pairwise uncrossability interactions, as in slip-link models. A pairwise parameter, which varies between these limiting cases, shows that, for the systems studied, the character of the entanglement environment is more pairwise than collective. We employ a novel methodology, which analyzes entanglement constraints into a complete set of pairwise interactions, similar to slip links. Entanglement confinement is assembled by a plethora of links, with a spectrum of confinement strengths, from strong to weak. The strength of interactions is quantified through a link `persistence', which is the fraction of time for which the links are active. By weighting links according to their strength, we show that confinement is imposed mainly by the strong ones, and that the weak, trapped, uncrossability interactions cannot contribute to the low frequency modulus of an elastomer, or the plateau modulus of a melt. A self-consistent scheme for mapping topological constraints to specific, strong binary links, according to a given entanglement density, is proposed and validated. Our results demonstrate that slip links can be viewed as the strongest pairwise interactions of a collective entanglement environment. The methodology developed provides a basis for bridging the gap between atomistic simulations and mesoscopic slip link models.

Stefanos D. Anogiannakis; Christos Tzoumanekas; Doros N. Theodorou

2012-12-06T23:59:59.000Z

405

A Study of Elementary Excitations of Liquid Helium-4 Using Macro-orbital Microscopic Theory  

E-Print Network (OSTI)

Energy of elementary excitations and the anomalous nature of small Q phonons in He-II are studied by using our macro-orbital microscopic theory of a system of interacting bosons (cond-mat/0606571). It is observed that : (i) the experimental E(Q) of He-II not only agrees with our theoretical relation $E(Q) = \\hbar^2Q^2/4mS(Q)$ but also supports an important conclusion of Price that S(0) should have zero value for quantum fluids, and (ii) Feynman's energy of excitations $E(Q)_{Fyn} = \\hbar^2Q^2/2mS(Q)$ equals approximately to $2E(Q)_{exp}$ even at low Q. Three problems with the Feynman's inference that $E(Q)_{Fyn}$ has good agreement with $E(Q)_{exp}$ at low Q are identified. It is argued that the theory can also be used to understand similar spectrum of the BEC state of a dilute gas reported by O'Dell et al.

Yatendra S. Jain

2006-09-18T23:59:59.000Z

406

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors  

NLE Websites -- All DOE Office Websites (Extended Search)

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print The possibility of using electrons' spins in addition to their charge in information technology has created much enthusiasm for a new field of electronics popularly known as "spintronics." An intensely studied approach to obtaining spin-polarized carriers for data-storage devices is the use of diluted magnetic semiconductors created by doping ions like Mn, Fe, or Co having a net spin into a semiconducting host such as GaAs, ZnO, or GaN. The interaction among these spins leads to ferromagnetic order at low temperatures, which is necessary to create spin-polarized carriers. A research team working at ALS Beamline 4.0.2 and European Synchrotron Radiation Facility Beamline ID8 made a big leap forward in clarifying the microscopic picture of magnetism and anisotropy in Mn-doped GaAs by resolving localized and hybridized d states using angle-dependent x-ray magnetic circular dichroism (XMCD) measurements.

407

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors  

NLE Websites -- All DOE Office Websites (Extended Search)

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print The possibility of using electrons' spins in addition to their charge in information technology has created much enthusiasm for a new field of electronics popularly known as "spintronics." An intensely studied approach to obtaining spin-polarized carriers for data-storage devices is the use of diluted magnetic semiconductors created by doping ions like Mn, Fe, or Co having a net spin into a semiconducting host such as GaAs, ZnO, or GaN. The interaction among these spins leads to ferromagnetic order at low temperatures, which is necessary to create spin-polarized carriers. A research team working at ALS Beamline 4.0.2 and European Synchrotron Radiation Facility Beamline ID8 made a big leap forward in clarifying the microscopic picture of magnetism and anisotropy in Mn-doped GaAs by resolving localized and hybridized d states using angle-dependent x-ray magnetic circular dichroism (XMCD) measurements.

408

Electronics Stewardship | Department of Energy  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

Electronics Electronics Stewardship Electronics Stewardship Mission The team promotes sustainable management of LM's electronic equipment by integrating the relevant requirements of Executive Order (EO) 13423, Strengthening Federal Environmental, Energy, and Transportation Management, and (EO) 13514, Federal Leadership in Environmental, Energy, and Economic Performance, and DOE Order 436.1, Departmental Sustainability, with LM activities, as approved by LM. The team advocates environmentally sound electronic stewardship practices. Scope The team uses a life-cycle approach to reduce the negative environmental impacts posed by electronic equipment. Established processes evaluate beneficial acquisition, use, and disposition of electronic equipment. Key Expectations Propose electronic stewardship goals/targets.

409

Advance Electronics | Open Energy Information  

Open Energy Info (EERE)

Advance Electronics Jump to: navigation, search Name Advance Electronics Place United Kingdom Zip LL14 3YR Product Develop and deliver power conditioners, transient suppressors,...

410

Circular free-electron laser  

DOE Patents (OSTI)

A high efficiency, free electron laser is described utilizing a circular relativistic electron beam accelerator and a circular whispering mode optical waveguide for guiding optical energy in a circular path in the circular relativistic electron beam accelerator such that the circular relativistic electron beam and the optical energy are spatially contiguous in a resonant condition for free electron laser operation. Both a betatron and synchrotron are disclosed for use in the present invention. A free electron laser wiggler is disposed around the circular relativistic electron beam accelerator for generating a periodic magnetic field to transform energy from the circular relativistic electron beam to optical energy.

Brau, C.A.; Kurnit, N.A.; Cooper, R.K.

1982-01-26T23:59:59.000Z

411

Electron Physics Group Staff Page  

Science Conference Proceedings (OSTI)

... Electron Physics Group Staff. ... Jabez McClelland, Group Leader Jabez McClelland is the Group Leader of the CNST Electron Physics Group. ...

2013-07-26T23:59:59.000Z

412

Electron Trapping by Molecular Vibration  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron Trapping by Molecular Vibration Print In photoelectron spectroscopy experiments performed at the ALS, a group of researchers has found that electronic transitions normally...

413

Circular free-electron laser  

DOE Patents (OSTI)

A high efficiency, free electron laser utilizing a circular relativistic electron beam accelerator and a circular whispering mode optical waveguide for guiding optical energy in a circular path in the circular relativistic electron beam accelerator such that the circular relativistic electron beam and the optical energy are spatially contiguous in a resonant condition for free electron laser operation. Both a betatron and synchrotron are disclosed for use in the present invention. A free electron laser wiggler is disposed around the circular relativistic electron beam accelerator for generating a periodic magnetic field to transform energy from the circular relativistic electron beam to optical energy.

Brau, Charles A. (Los Alamos, NM); Kurnit, Norman A. (Santa Fe, NM); Cooper, Richard K. (Los Alamos, NM)

1984-01-01T23:59:59.000Z

414

Electron spin resonance shift and linewidth broadening of nitrogen-vacancy centers in diamond as a function of electron irradiation dose  

SciTech Connect

A high-nitrogen-concentration diamond sample was subjected to 200-keV electron irradiation using a transmission electron microscope. The optical and spin-resonance properties of the nitrogen-vacancy (NV) color centers were investigated as a function of the irradiation dose up to 6.4 Multiplication-Sign 10{sup 21} e{sup -}/cm{sup 2}. The microwave transition frequency of the NV{sup -} center was found to shift by up to 0.6% (17.1 MHz) and the linewidth broadened with increasing electron-irradiation dose. Unexpectedly, the measured magnetic sensitivity is best at the lowest irradiation dose, even though the NV concentration increases monotonically with increasing dose. This is in large part due to a sharp reduction in optically detected spin contrast at higher doses.

Kim, Edwin [Ramtron International Corporation, 1850 Ramtron Drive, Colorado Springs, Colorado 80921 (United States); Acosta, Victor M. [Hewlett-Packard Laboratories, 1501 Page Mill Road, Palo Alto, California 94304 (United States); Department of Physics, University of California, Berkeley, California 94720-7300 (United States); Bauch, Erik [Department of Physics, University of California, Berkeley, California 94720-7300 (United States); Technische Universitaet Berlin, Hardenbergstrasse 28, 10623 Berlin (Germany); Budker, Dmitry [Department of Physics, University of California, Berkeley, California 94720-7300 (United States); Nuclear Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Hemmer, Philip R. [Department of Electrical and Computer Engineering, Texas A and M University, College Station, Texas 77843-3128 (United States)

2012-08-20T23:59:59.000Z

415

28 00 00 ELECTRONIC SAFETY AND SECURITY ELECTRONIC SECURITY  

E-Print Network (OSTI)

28 00 00 ELECTRONIC SAFETY AND SECURITY ELECTRONIC SECURITY SYSTEM DESIGN, CONSTRUCTION Services #12;28 00 00 ELECTRONIC SAFETY AND SECURITY August 8, 2011 2 THE UNIVERSITY OF TEXAS AT AUSTIN ELECTRONIC SECURITY SYSTEM DESIGN, CONSTRUCTION AND COMMISSIONING GUIDE PART 1 - GENERAL 1.1 NOTICE

Texas at Austin, University of

416

28 00 00 ELECTRONIC SAFETY AND SECURITY ELECTRONIC SECURITY  

E-Print Network (OSTI)

28 00 00 ELECTRONIC SAFETY AND SECURITY ELECTRONIC SECURITY SYSTEM DESIGN, CONSTRUCTION Services #12;28 00 00 ELECTRONIC SAFETY AND SECURITY May 1, 2013 2 THE UNIVERSITY OF TEXAS AT AUSTIN ELECTRONIC SECURITY SYSTEM DESIGN, CONSTRUCTION AND COMMISSIONING GUIDE PART 1 - GENERAL 1.1 NOTICE

Texas at Austin, University of

417

ELECTRON EMISSION REGULATING MEANS  

DOE Patents (OSTI)

>An electronic regulating system is described for controlling the electron emission of a cathode, for example, the cathode in a mass spectrometer. The system incorporates a transformer having a first secondary winding for the above-mentioned cathode and a second secondary winding for the above-mentioned cathode and a second secondary winding load by grid controlled vacuum tubes. A portion of the electron current emitted by the cathode is passed through a network which develops a feedback signal. The system arrangement is completed by using the feedback signal to control the vacuum tubes in the second secondary winding through a regulator tube. When a change in cathode emission occurs, the feedback signal acts to correct this change by adjusting the load on the transformer.

Brenholdt, I.R.

1957-11-19T23:59:59.000Z

418

Electron launching voltage monitor  

DOE Patents (OSTI)

An electron launching voltage monitor measures MITL voltage using a relationship between anode electric field and electron current launched from a cathode-mounted perturbation. An electron launching probe extends through and is spaced from the edge of an opening in a first MITL conductor, one end of the launching probe being in the gap between the MITL conductor, the other end being adjacent a first side of the first conductor away from the second conductor. A housing surrounds the launching probe and electrically connects the first side of the first conductor to the other end of the launching probe. A detector detects the current passing through the housing to the launching probe, the detected current being representative of the voltage between the conductors.

Mendel, Clifford W. (Albuquerque, NM); Savage, Mark E. (Albuquerque, NM)

1992-01-01T23:59:59.000Z

419

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Acknowledgment Acknowledgment EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÃ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Acknowledgment Please acknowledge your use of the EMC in your publications and presentations with the following acknowledgment statement: The electron microscopy was accomplished at the Electron Microscopy Center at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC.

420

Electronic ballast improves efficiency  

SciTech Connect

As part of a DOE program, the performance of various electronic ballasts for fluorescent lamps have been evaluated relative to high quality core-coil ballasts under similar ambient conditions. The results of this investigation are reported. Real energy savings can exceed 40% while comfort and quality of illumination are improved. A detailed comparison of two types of ballast is presented. Voltage effects and temperature effects as well as dimming features are discussed. Light levels, power energy consumption, and daylighting are also treated. It is concluded that, with the electronic ballast, an annual payback of $8.20/yr is possible as compared to the core-coil ballasted fluorescent lamp. Further, much greater flexibility in use is possible with the electronic ballast equipped lamp. (MJJ)

Verderber, R.R.

1980-11-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


421

Electron-electron interactions in fast neutral-neutral collisions  

DOE Green Energy (OSTI)

Differential electron emission is studied for 50--500 keV H{sup +} and H atom impact on helium. Using the first Born formulation, it is shown that projectile electron-target electron interactions are expected to dominate the differential cross sections for low energy target electron emission induced by fast neutral projectile impact on any target. Measurements of the 15{degrees} electron emission were made in order to investigate this prediction. For low impact energies, a constant ratio between the hydrogen atom and proton impact cross sections was found for emitted electron velocities less than half the projectile velocity, V{sub p} But as the collision energy increased, for electron velocities less than 0.25 V{sub p}, the cross section ratio increased as the emitted electron velocity decreased. This is interpreted as a signature of projectile electron-target electron interactions becoming dominant for distant collisions between neutral particles.

DuBois, R.D. [Pacific Northwest Lab., Richland, WA (United States); Manson, S.T. [Georgia State Univ., Atlanta, GA (United States). Dept. of Physics and Astronomy

1992-11-01T23:59:59.000Z

422

Electron-electron interactions in fast neutral-neutral collisions  

DOE Green Energy (OSTI)

Differential electron emission is studied for 50--500 keV H[sup +] and H atom impact on helium. Using the first Born formulation, it is shown that projectile electron-target electron interactions are expected to dominate the differential cross sections for low energy target electron emission induced by fast neutral projectile impact on any target. Measurements of the 15[degrees] electron emission were made in order to investigate this prediction. For low impact energies, a constant ratio between the hydrogen atom and proton impact cross sections was found for emitted electron velocities less than half the projectile velocity, V[sub p] But as the collision energy increased, for electron velocities less than 0.25 V[sub p], the cross section ratio increased as the emitted electron velocity decreased. This is interpreted as a signature of projectile electron-target electron interactions becoming dominant for distant collisions between neutral particles.

DuBois, R.D. (Pacific Northwest Lab., Richland, WA (United States)); Manson, S.T. (Georgia State Univ., Atlanta, GA (United States). Dept. of Physics and Astronomy)

1992-11-01T23:59:59.000Z

423

Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation  

SciTech Connect

In this paper, we present a newly developed gating technique for a time-resolving photoemission microscope. The technique makes use of an electrostatic deflector within the microscope's electron optical system for fast switching between two electron-optical paths, one of which is used for imaging, while the other is blocked by an aperture stop. The system can be operated with a switching time of 20 ns and shows superior dark current rejection. We report on the application of this new gating technique to exploit the time structure in the injection bunch pattern of the synchrotron radiation source BESSY II at Helmholtz-Zentrum Berlin for time-resolved measurements in the picosecond regime.

Wiemann, C.; Kaiser, A. M.; Cramm, S. [Peter Gruenberg Institut PGI-6 'Electronic Properties', Research Centre Juelich, D-52425 Juelich (Germany); Schneider, C. M. [Peter Gruenberg Institut PGI-6 'Electronic Properties', Research Centre Juelich, D-52425 Juelich (Germany); Fakultaet fuer Physik and Center for Nanointegration Duisburg-Essen (CeNIDE), Universitaet Duisburg-Essen, D-47048 Duisburg (Germany)

2012-06-15T23:59:59.000Z

424

ElectronicFabrication  

NLE Websites -- All DOE Office Websites (Extended Search)

Fabrication Fabrication Manufacturing Technologies Electronic Fabrication provides our cus- tomers solutions for the packaging design, production acceptable prototype fabrica- tion, or deliverable production fabrication. Capabilities * Final electronic product packaging from sketches and verbal instructions * Provide CAD drawing package after project completion if no formal prints are available * Complete system development and fab- rication through concurrent engineering * Concurrent engineering in prototype and production fabrication * Integrate commercial equipment into prototype system design * Implementation and modification of commercial equipment * Packaging of prototype into finalized product assembly Resources * Customer assistance from fabrication, to testing, to complete system installation

425

ElectronicPackaging  

NLE Websites -- All DOE Office Websites (Extended Search)

Packaging Packaging Manufacturing Technologies The Electronic Packaging technologies in the Thin Film, Vacuum, and Packaging Department are a resource for all aspects of microelectronic packag- ing. From design and layout to fabrication of proto- type samples, the staff offers partners the opportu- nity for concurrent engineering and development of a variety of electronic packaging concepts. This includes assistance in selecting the most appropri- ate technology for manufacturing, analysis of per- formance characteristics and development of new and unique processes. Capabilities 1. Network Fabrication * Low Temperature Co-Fired Ceramic (LTCC) * Thick Film * Thin Film 2. Packaging and Assembly * Chip Level Packaging * MEMs Packaging * Hermetic Sealing * Surface Mount Technology

426

Precision electron polarimetry  

SciTech Connect

A new generation of precise Parity-Violating experiments will require a sub-percent accuracy of electron beam polarimetry. Compton polarimetry can provide such accuracy at high energies, but at a few hundred MeV the small analyzing power limits the sensitivity. M{\\o}ller polarimetry provides a high analyzing power independent on the beam energy, but is limited by the properties of the polarized targets commonly used. Options for precision polarimetry at ~300 MeV will be discussed, in particular a proposal to use ultra-cold atomic hydrogen traps to provide a 100\\%-polarized electron target for M{\\o}ller polarimetry.

Chudakov, Eugene A. [JLAB

2013-11-01T23:59:59.000Z

427

Electronically configured battery pack  

DOE Green Energy (OSTI)

Battery packs for portable equipment must sometimes accommodate conflicting requirements to meet application needs. An electronically configurable battery pack was developed to support two highly different operating modes, one requiring very low power consumption at a low voltage and the other requiring high power consumption at a higher voltage. The configurable battery pack optimizes the lifetime and performance of the system by making the best use of all available energy thus enabling the system to meet its goals of operation, volume, and lifetime. This paper describes the cell chemistry chosen, the battery pack electronics, and tradeoffs made during the evolution of its design.

Kemper, D.

1997-03-01T23:59:59.000Z

428

A graphene electron lens  

SciTech Connect

An epitaxial layer of graphene was grown on a pre patterned 6H-SiC(0001) crystal. The graphene smoothly covers the hexagonal nano-holes in the substrate without the introduction of small angle grain boundaries or dislocations. This is achieved by an elastic deformation of the graphene by {approx_equal}0.3% in accordance to its large elastic strain limit. This elastic stretching of the graphene leads to a modification of the band structure and to a local lowering of the electron group velocity of the graphene. We propose to use this effect to focus two-dimensional electrons in analogy to simple optical lenses.

Gerhard, L.; Balashov, T.; Wulfhekel, W. [Physikalisches Institut, Karlsruhe Institute of Technology, Wolfgang-Gaede-Str. 1, 76131 Karlsruhe (Germany); Moyen, E.; Ozerov, I.; Sahaf, H.; Masson, L.; Hanbuecken, M. [CINaM-CNRS, Aix-Marseille University, Campus Luminy - Case 913, 18288 Marseille (France); Portail, M. [CRHEA-CNRS, Parc de Sophia - Antipolis, rue B. Gregory, 06560 Valbonne (France)

2012-04-09T23:59:59.000Z

429

X-ray holographic microscopy using the atomic-force microscope  

Science Conference Proceedings (OSTI)

The present authors have been seeking for some time to improve the resolution of holographic microscopy and have engaged in a continuing series of experiments using the X1A soft x-ray undulator beam line at Brookhaven. The principle strategy for pushing the resolution lower in these experiments has been the use of polymer resists as x-ray detectors and the primary goal has been to develop the technique to become useful for examining wet biological material. In the present paper the authors report on progress in the use of resist for high-spatial-resolution x-ray detection. This is the key step in in-line holography and the one which sets the ultimate limit to the image resolution. The actual recording has always been quite easy, given a high-brightness undulator source, but the difficult step was the readout of the recorded pattern. The authors describe in what follows how they have built a special instrument: an atomic force microscope (AFM) to read holograms recorded in resist. They report the technical reasons for building, rather than buying, such an instrument and they give details of the design and performance of the device. The authors also describe the first attempts to use the system for real holography and the authors show results of both recorded holograms and the corresponding reconstructed images. Finally, the authors try to analyze the effect that these advances are likely to have on the future prospects for success in applications of x-ray holography and the degree to which the other technical systems that are needed for such success are available or within reach.

Howells, M.R. [Lawrence Berkeley Lab., CA (United States); Jacobsen, C.J.; Lindaas, S. [State Univ. of New York, Stony Brook, NY (United States). Physics Dept.

1993-09-01T23:59:59.000Z

430

Electron Beam Powder Bed Processes  

Science Conference Proceedings (OSTI)

Advanced Materials, Processes and Applications for Additive Manufacturing : Electron Beam Powder Bed Processes Program Organizers: Andrzej ...

431

Determination of the displacement energy of O, Si and Zr under electron beam irradiation  

Science Conference Proceedings (OSTI)

The response of nanocrystalline, stabilizer-free cubic zirconia thin films on a Si substrate to electron beam irradiation with energies of 4, 110 and 200 keV and fluences up to {approx}1.5 x 10{sup 22} e m{sup -2} has been studied to determine the displacement energies. The 110 and 200 keV irradiations were performed in situ using a transmission electron microscope; the 4 keV irradiations were performed ex situ using an electron gun. In all three irradiations, no structural modification of the zirconia was observed, despite the high fluxes and fluences. However the Si substrate on which the zirconia film was deposited was amorphized under the 200 keV electron irradiation. Examination of the electron-solid interactions reveals that the kinetic energy transfer from the 200 keV electrons to the silicon lattice is sufficient to cause atomic displacements, resulting in amorphization. The kinetic energy transfer from the 200 keV electrons to the oxygen sub-lattice of the zirconia may be sufficient to induce defect production, however, no evidence of defect production was observed. The displacement cross-section value of Zr was found to be {approx}400 times greater than that of O indicating that the O atoms are effectively screened from the electrons by the Zr atoms, and, therefore, the displacement of O is inefficient.

Edmondson, Philip D [ORNL; Weber, William J [ORNL; Namavar, Fereydoon [University of Nebraska Medical Center; Zhang, Yanwen [ORNL

2012-01-01T23:59:59.000Z

432

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites

Laboratory Laboratory Electron Microscopy Center Argonne Home > EMC > EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SÃ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

433

electronic reprint Crystallography  

E-Print Network (OSTI)

electronic reprint Journal of Applied Crystallography ISSN 0021-8898 Molsee: a Tcl/Tk-based program of Crystallography Printed in Great Britain ± all rights reserved Molsee: a Tcl/Tk-based program to control Rasmol molecules. In order to make it more user-friendly, Molsee, a Tcl/Tk-based graphical user interface front end

Luhua, Lai

434

Electron beam cutting  

DOE Patents (OSTI)

A method for the cutting of holes 20 Angstroms in diameter, or lines 20 Angstroms wide in a material having positive ionic conduction by the use of a focused electron probe is described. The holes and lines are stable under ambient conditions.

Mochel, Margaret E. (Champaign, IL); Humphreys, Colin J. (Abingdon, GB2)

1985-04-02T23:59:59.000Z

435

Superconductivity and electron tunneling  

Science Conference Proceedings (OSTI)

Experiments on the tunneling of electrons through a thin dielectric layer separating two superconducting metals are reported. Data are presented for the pairs AI-Pb, Sn-Pb, and In-Sn. Particular attention is paid to the form of the tunneling current ...

S. Shapiro; P. H. Smith; J. Nicol; J. L. Miles; P. F. Strong

1962-01-01T23:59:59.000Z

436

ELECTRONIC DIGITAL COMPUTER  

DOE Patents (OSTI)

The electronic digital computer is designed to solve systems involving a plurality of simultaneous linear equations. The computer can solve a system which converges rather rapidly when using Von Seidel's method of approximation and performs the summations required for solving for the unknown terms by a method of successive approximations.

Stone, J.J. Jr.; Bettis, E.S.; Mann, E.R.

1957-10-01T23:59:59.000Z

437

Calorimeter Electronics Jim Pilcher  

E-Print Network (OSTI)

photons to electrical signal Photons from Cerenkov radiation or scintillation Amplify the number diverse device Many sizes and shapes Much experience from years of usage and development Wide range. Pilcher9 The Physics of PMTs Design principle Amplification by electron acceleration in electric field

438

Electron beam cutting  

DOE Patents (OSTI)

A method for the cutting of holes 20 Angstroms in diameter, or lines 20 Angstroms wide in a material having positive ionic conduction by the use of a focused electron probe is described. The holes and lines are stable under ambient conditions. 2 figs.

Mochel, M.E.; Humphreys, C.J.

1985-04-02T23:59:59.000Z

439

Energy Storage & Power Electronics 2008 Peer Review - Power Electronics  

Energy.gov (U.S. Department of Energy (DOE)) Indexed Site

& Power Electronics 2008 Peer Review - Power & Power Electronics 2008 Peer Review - Power Electronics (PE) Systems Presentations Energy Storage & Power Electronics 2008 Peer Review - Power Electronics (PE) Systems Presentations The 2008 Peer Review Meeting for the DOE Energy Storage and Power Electronics Program (ESPE) was held in Washington DC on Sept. 29-30, 2008. Current and completed program projects were presented and reviewed by a group of industry professionals. The 2008 agenda was composed of 28 projects that covered a broad range of new and ongoing, state-of-the-art, energy storage and power electronics technologies, including updates on the collaborations among DOE/ESPE, CEC in California, and NYSERDA in New York. Power Electronics (PE) Systems presentations are available below. ESPE 2008 Peer Review - High Power Density Silicon Carbide Power Electronic

440

A new Scanning Transmission X-ray Microscope at the ALS for operation up to 2500eV  

Science Conference Proceedings (OSTI)

We report on the design and construction of a higher energy Scanning Transmission X-ray Microscope on a new bend magnet beam line at the Advanced Light Source. Previously we have operated such an instrument on a bend magnet for C, N and O 1s NEXAFS spectroscopy. The new instrument will have similar performance at higher energies up to and including the S 1s edge at 2472eV. A new microscope configuration is planned. A more open geometry will allow a fluorescence detector to count emitted photons from the front surface of the sample. There will be a capability for zone plate scanning in addition to the more conventional sample scanning mode. This will add the capability for imaging a massive sample at high resolution over a limited field of view, so that heavy reaction cells may be used to study processes in-situ, exploiting the longer photon attenuation length and the longer zone plate working distances available at higher photon energy. The energy range will extend down to include the C1s edge at 300eV, to allow high energy NEXAFS microscopic studies to correlate with the imaging of organics in the same sample region of interest.

Kilcoyne, David; McKean, Pat; Tyliszczak, Tolek; Warwick, Tony [Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, California (United States); Ade, Harald [Department of Physics, North Carolina State University, Raleigh, North Carolina (United States); Attwood, David [Center for Xray Optics, Lawrence Berkeley Laboratory, Berkeley, California (United States); Hitchcock, Adam [Brockhouse Institute for Materials Research, McMaster University, Hamilton, Ontario (Canada); Mitchell, Gary [DOW Chemical Company, Midland, Michigan (United States); Monteiro, Paulo [Dept. Civil and Environmental Engineering, University of California, Berkeley, California (United States)

2010-06-23T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


441

A new Scanning Transmission X-ray Microscope at the ALS for operation up to 2500eV  

Science Conference Proceedings (OSTI)

We report on the design and construction of a higher energy Scanning Transmission X-ray Microscope on a new bend magnet beam line at the Advanced Light Source. Previously we have operated such an instrument on a bend magnet for C, N and O 1s NEXAFS spectroscopy. The new instrument will have similar performance at higher energies up to and including the S 1s edge at 2472eV. A new microscope configuration is planned. A more open geometry will allow a fluorescence detector to count emitted photons from the front surface of the sample. There will be a capability for zone plate scanning in addition to the more conventional sample scanning mode. This will add the capability for imaging a massive sample at high resolution over a limited field of view, so that heavy reaction cells may be used to study processes in-situ, exploiting the longer photon attenuation length and the longer zone plate working distances available at higher photon energy. The energy range will extend down to include the C1s edge at 300eV, to allow high energy NEXAFS microscopic studies to correlate with the imaging of organics in the same sample region of interest.

Kilcoyne, David; Ade, Harald; Attwood, David; Hitchcock, Adam; McKean, Pat; Mitchell, Gary; Monteiro, Paulo; Tyliszczak, Tolek; Warwick, Tony

2010-01-31T23:59:59.000Z

442

Argonne CNM: Electronic & Magnetic Materials & Devices Capabilities  

NLE Websites -- All DOE Office Websites (Extended Search)

Electronic & Magnetic Materials & Devices Capabilities Synthesis Colloidal chemistry and self-assembly techniques Complex oxide film synthesis via molecular beam epitaxy (DCA R450 Custom) Physical vapor deposition (Lesker CMS 18 and PVD 250) Spin coating (Laurell WS-400) Characterization Variable-temperature (VT) scanning tunneling microscope with atomic force microscopy capabilities (Omicron VT-AFM/STM), operates in an ultrahigh vacuum (UHV) environment with a base pressure of < 1E-10 mbar and 55-400 K. Atomic resolution is routinely obtained at room temperature and below. The AFM capabilities support a range of scanning modes. The analysis chamber also houses a LEED/Auger with an attached preparation chamber for sample cleaning and deposition (sputter cleaning, direct current heating, e-beam heating stage, metal deposition, etc.)

443

Towards demonstration of electron cooling with bunched electron beam  

SciTech Connect

All electron cooling systems which were in operation so far employed electron beam generated with an electrostatic electron gun in DC operating mode, immersed in a longitudinal magnetic field. At low energies magnetic field is also being used to transport electron beam through the cooling section from the gun to the collector. At higher energies (few MeV), it was shown that one can have simpler electron beam transport without continuous magnetic field. Because of a rather weak magnetic field on the cathode and in the cooling section the latter approach was referred to as 'non-magnetized cooling', since there was no suppression of the transverse angular spread of the electron beam with the magnetic field in the cooling section. Such a cooler successfully operated at FNAL (2005-11) at electron beam energy of 4.3 MeV. Providing cooling at even higher energies would be easier with RF acceleration of electron beam, and thus using bunched electron beam for cooling. Significant efforts were devoted to explore various aspects of such bunched electron beam cooling as part of R and D of high-energy electron cooling for RHIC. However, experimental studies of such cooling are still lacking. Establishing this technique experimentally would be extremely useful for future high-energy applications. Presently there is an ongoing effort to build Proof-of-Principle (PoP) experiment of Coherent Electron Cooling (CEC) at RHIC, which promises to be superior to conventional electron cooling for high energies. Since the CEC experiment is based on bunched electron beam and it has sections where electron beam co-propagates with the ion beam at the same velocity, it also provides a unique opportunity to explore experimentally conventional electron cooling but for the first time with a bunched electron beam. As a result, it allows us to explore techniques needed for the high-energy electron cooling such as 'painting' with a short electron beam and control of ion beam distribution under cooling which is essential if cooling is provided in a collider. The software needed for comparison with the experiments is already developed as part of the previous high-energy electron cooling studies for RHIC. Since electron beam will be non-magnetized and there will be no magnetic field in the cooling section it will be also a first demonstration of fully non-magnetized cooling. The purpose of these studies was to explore whether we would be able to observe conventional electron cooling with parameters expected in the CEC PoP experiment. Below we summarize requirements on electron beam and cooling section needed for such demonstration.

Fedotov, A.

2012-01-11T23:59:59.000Z

444

Electron backscatter diffraction of plutonium-gallium alloys  

Science Conference Proceedings (OSTI)

At Los Alamos National Laboratory a recent experimental technique has been developed to characterize reactive metals, including plutonium arid cerium, using electron backscatter diffraction (EBSD). Microstructural characterization of plutonium and its alloys by EBSD had been previously elusive primarily because of the extreme toxicity and rapid surface oxidation rate associated with plutonium metal. The experimental techniques, which included ion-sputtering the metal surface using a scanning auger microprobe (SAM) followed by vacuum transfer of the sample from the SAM to the scanning electron microscope (SEM), used to obtain electron backscatter diffraction Kikuchi patterns (EBSPs) and orientation maps for plutonium-gallium alloys are described and the initial microstructural observations based on the analysis are discussed. Combining the SEM and EBSD observations, the phase transformation behavior between the {delta} and {var_epsilon} structures was explained. This demonstrated sample preparation and characterization technique is expected to be a powerful means to further understand phase transformation behavior, orientation relationships, and texlure in the complicated plutonium alloy systems.

Boehlert, C. J. (Carl J.); Zocco, T. G. (Thomas G.); Schulze, R. K. (Roland K.); Mitchell, J. N. (Jeremy N.); Pereyra, R. A. (Ramiro A.)

2002-01-01T23:59:59.000Z

445

Electronics & Telecommunications Programs/Projects in PML  

Science Conference Proceedings (OSTI)

Electronics & Telecommunications Programs/Projects in PML. ... Electric Power Metrology and the Smart Grid. Electronic Kilogram. ...

2010-10-05T23:59:59.000Z

446

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

An Office of Science User Facility An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

447

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

SAMM SAMM EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SÃ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Sub-Ã…ngstrom Microscopy and Microanalysis Facility In order to meet the scientific challenges of the future, the EMC has built a new state-of-the-art laboratory space for advanced electron microscopy. The new building has been designed to provide next- generation science with an operating environment that cannot be attained by renovating existing facilities. The EMC staff learned as much as possible from similar efforts around the world, including the SuperSTEM building at Daresbury, the Triebenberg Special Laboratory, the AML at Oak Ridge National Laboratory, the new NIST building, and various facilities for nanoscience.

448

Electron-doping  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron-doping Electron-doping evolution of the low-energy spin excitations in the iron arsenide superconductor BaFe 2-x Ni x As 2 Miaoyin Wang, 1 Huiqian Luo, 2 Jun Zhao, 1 Chenglin Zhang, 1 Meng Wang, 2,1 Karol Marty, 3 Songxue Chi, 4 Jeffrey W. Lynn, 4 Astrid Schneidewind, 5,6 Shiliang Li, 2, * and Pengcheng Dai 1,2,3,† 1 Department of Physics and Astronomy, The University of Tennessee, Knoxville, Tennessee 37996-1200, USA 2 Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100190, China 3 Neutron Scattering Science Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6393, USA 4 NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA 5 Gemeinsame Forschergruppe HZB, Helmholtz-Zentrum Berlin für Materialien und Energie, D-14109

449

ELECTRON IRRADIATION OF SOLIDS  

DOE Patents (OSTI)

A method is presented for altering physical properties of certain solids, such as enhancing the usefulness of solids, in which atomic interchange occurs through a vacancy mechanism, electron irradiation, and temperature control. In a centain class of metals, alloys, and semiconductors, diffusion or displacement of atoms occurs through a vacancy mechanism, i.e., an atom can only move when there exists a vacant atomic or lattice site in an adjacent position. In the process of the invention highenergy electron irradiation produces additional vacancies in a solid over those normally occurring at a given temperature and allows diffusion of the component atoms of the solid to proceed at temperatures at which it would not occur under thermal means alone in any reasonable length of time. The invention offers a precise way to increase the number of vacancies and thereby, to a controlled degree, change the physical properties of some materials, such as resistivity or hardness.

Damask, A.C.

1959-11-01T23:59:59.000Z

450

Power electronics reliability.  

Science Conference Proceedings (OSTI)

The project's goals are: (1) use experiments and modeling to investigate and characterize stress-related failure modes of post-silicon power electronic (PE) devices such as silicon carbide (SiC) and gallium nitride (GaN) switches; and (2) seek opportunities for condition monitoring (CM) and prognostics and health management (PHM) to further enhance the reliability of power electronics devices and equipment. CM - detect anomalies and diagnose problems that require maintenance. PHM - track damage growth, predict time to failure, and manage subsequent maintenance and operations in such a way to optimize overall system utility against cost. The benefits of CM/PHM are: (1) operate power conversion systems in ways that will preclude predicted failures; (2) reduce unscheduled downtime and thereby reduce costs; and (3) pioneering reliability in SiC and GaN.

Kaplar, Robert James; Brock, Reinhard C.; Marinella, Matthew; King, Michael Patrick; Stanley, James K.; Smith, Mark A.; Atcitty, Stanley

2010-10-01T23:59:59.000Z

451

Electronics for Satellite Experiments  

SciTech Connect

The tracking detector for the LAT science instrument on the GLAST mission is an example of a large-scale particle detection system built primarily by particle physicists for space flight within the context of a NASA program. The design and fabrication model in most ways reflected practice and experience from particle physics, but the quality assurance aspects were guided by NASA. Similarly, most of the electronics in the LAT as a whole were designed and built by staff at a particle physics lab. This paper reports on many of the challenges and lessons learned in the experience of designing and building the tracking detector and general LAT electronics for use in the NASA GLAST mission.

Johnson, Robert P.; /UC, Santa Cruz

2006-05-16T23:59:59.000Z

452

Electronic Compact Fluorescent Lamps  

Science Conference Proceedings (OSTI)

This EPRI Technical Update addresses the fastest growing energy efficient light source the electronic compact fluorescent lamp (CFL). Business and technical market factors (Chapter 2) explain the past and future growth of the CFL market while emphasizing future technical improvements along with discussion of the importance of utility involvement in helping their customers make the switch from incandescent lamps to CFLs. The basic CFL technology is covered in Chapter 3 including test results for selected ...

2007-12-18T23:59:59.000Z

453

Relativistic electron beam device  

DOE Patents (OSTI)

A design is given for an electron beam device for irradiating spherical hydrogen isotope bearing targets. The accelerator, which includes hollow cathodes facing each other, injects an anode plasma between the cathodes and produces an approximately 10 nanosecond, megajoule pulse between the anode plasma and the cathodes. Targets may be repetitively positioned within the plasma between the cathodes, and accelerator diode arrangement permits materials to survive operation in a fusion power source. (auth)

Freeman, J.R.; Poukey, J.W.; Shope, S.L.; Yonas, G.

1975-07-01T23:59:59.000Z

454

Xyce parallel electronic simulator.  

Science Conference Proceedings (OSTI)

This document is a reference guide to the Xyce Parallel Electronic Simulator, and is a companion document to the Xyce Users' Guide. The focus of this document is (to the extent possible) exhaustively list device parameters, solver options, parser options, and other usage details of Xyce. This document is not intended to be a tutorial. Users who are new to circuit simulation are better served by the Xyce Users' Guide.

Keiter, Eric Richard; Mei, Ting; Russo, Thomas V.; Rankin, Eric Lamont; Schiek, Richard Louis; Thornquist, Heidi K.; Fixel, Deborah A.; Coffey, Todd Stirling; Pawlowski, Roger Patrick; Santarelli, Keith R.

2010-05-01T23:59:59.000Z

455

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Training Training EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÃ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers User Training Prior Training in Electron Microscopy: People who wish to operate TEMs must have at least one college-level course in TEM with a lab component or previous TEM experience. The college course can't be one in which TEM was just one of many topics. For researchers who lack academic training and/or practical experience in electron microscopy, we suggest the short courses in TEM at the Hooke College of Applied Sciences, and the hands-on TEM courses at Northwestern University or the University of Chicago or Northern Illinois University.

456

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

Overview Overview The mission of the Electron Microscopy Center (EMC) is to: Conduct materials research using advanced microstructural characterization methods; Maintain unique resources and facilities for scientific research for the both the Argonne National Laboratory and national scientific community. Develop and expand the frontiers of microanalysis by fostering the evolution of synergistic state-of-the-art resources in instrumentation, techniques and scientific expertise; The staff members of the EMC carry out their own research as well as participate in collaborative programs with other scientists at Argonne National Laboratory as well as researchers, educators and students worldwide. The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff perform collaborative research with members of other Divisions at Argonne National Laboratory and with collaborators from universities and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

457

Organizational Assimilation of Electronic Procurement Innovations  

Science Conference Proceedings (OSTI)

We investigate the assimilation of electronic procurement innovations (EPIs) and its impact on procurement productivity in buyer organizations. We identify online reverse auctions, electronic catalog management, electronic order fulfillment, and electronic ... Keywords: Electronic Procurement Innovations, It Assimilation, Productivity, Structuration Theory

Arun Rai; Paul Brown; Xinlin Tang

2009-07-01T23:59:59.000Z

458

Single electron beam rf feedback free electron laser  

DOE Patents (OSTI)

A free electron laser system and electron beam system for a free electron laser which uses rf feedback to enhance efficiency are described. Rf energy is extracted from a single electron beam by decelerating cavities and energy is returned to accelerating cavities using rf returns, such as rf waveguides, rf feedthroughs, resonant feedthroughs, etc. This rf energy is added to rf klystron energy to reduce the required input energy and thereby enhance energy efficiency of the system.

Brau, C.A.; Stein, W.E.; Rockwood, S.D.

1981-02-11T23:59:59.000Z

459

Simulation study of electron response amplification in coherent electron cooling  

Science Conference Proceedings (OSTI)

In Coherent Electron Cooling (CEC), it is essential to study the amplification of electron response to a single ion in the FEL process, in order to proper align the electron beam and the ion beam in the kicker to maximize the cooling effect. In this paper, we use Genesis to simulate the amplified electron beam response of single ion in FEL amplification process, which acts as Green's function of the FEL amplifier.

Hao Y.; Litvinenko, V.N.

2012-05-20T23:59:59.000Z

460

RHIC | Electron-Ion Collider  

NLE Websites -- All DOE Office Websites (Extended Search)

Electron-Ion Collider A breakthrough particle accelerator could collide electrons with heavy ions or protons at nearly the speed of light to create rapid-fire, high-resolution...

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


461

Scanning tunneling microscopic studies of SiO2 thin film supported metal nano-clusters  

E-Print Network (OSTI)

This dissertation is focused on understanding heterogeneous metal catalysts supported on oxides using a model catalyst system of SiO2 thin film supported metal nano-clusters. The primary technique applied to this study is scanning tunneling microscopy (STM). The most important constituent of this model catalyst system is the SiO2 thin film, as it must be thin and homogeneous enough to apply electron or ion based surface science techniques as well as STM. Ultra-thin SiO2 films were successfully synthesized on a Mo(112) single crystal. The electronic and geometric structure of the SiO2 thin film was investigated by STM combined with LEED, Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). The relationship between defects on the SiO2 thin film and the nucleation and growth of metal nano-clusters was also investigated. By monitoring morphology changes during thermal annealing, it was found that the metal-support interaction is strongly dependent on the type of metal as well as on the defect density of the SiO2 thin film. Especially, it was found that oxygen vacancies and Si impurities play an important role in the formation of Pd-silicide. By substituting Ti atoms into the SiO2 thin film network, an atomically mixed TiO2-SiO2 thin film was synthesized. Furthermore, these Ti atoms play a role as heterogeneous defects, resulting in the creation of nucleation sites for Au nano-clusters. A marked increase in Au cluster density due to Ti defects was observed in STM. A TiO2-SiO2 thin film consisting of atomic Ti as well as TiOx islands was also synthesized by using higher amounts of Ti (17 %). More importantly, this oxide surface was found to have sinter resistant properties for Au nano-clusters, which are desirable in order to make highly active Au nano-clusters more stable under reaction conditions.

Min, Byoung Koun

2004-08-01T23:59:59.000Z

462

Security Aspects of Electronic Voting  

Science Conference Proceedings (OSTI)

Security Aspects of Electronic Voting. Summary: The Help America Vote Act (HAVA) of 2002 was passed by Congress to ...

2013-08-01T23:59:59.000Z

463

Rf Feedback free electron laser  

DOE Patents (OSTI)

A free electron laser system and electron beam system for a free electron laser which use rf feedback to enhance efficiency. Rf energy is extracted from an electron beam by decelerating cavities and returned to accelerating cavities using rf returns such as rf waveguides, rf feedthroughs, etc. This rf energy is added to rf klystron energy to lower the required input energy and thereby enhance energy efficiency of the system.

Brau, Charles A. (Los Alamos, NM); Swenson, Donald A. (Los Alamos, NM); Boyd, Jr., Thomas J. (Los Alamos, NM)

1981-01-01T23:59:59.000Z

464

Advanced Developments in Electron Microscopy  

Science Conference Proceedings (OSTI)

About this Symposium. Meeting, Materials Science & Technology 2011. Symposium, Advanced Developments in Electron Microscopy. Sponsorship, MS&T ...

465

Rf feedback free electron laser  

DOE Patents (OSTI)

A free electron laser system and electron beam system for a free electron laser are provided which use rf feedback to enhance efficiency. Rf energy is extracted from an electron beam by decelerating cavities and returned to accelerating cavities using rf returns such as rf waveguides, rf feedthroughs, etc. This rf energy is added to rf klystron energy to lower the required input energy and thereby enhance energy efficiency of the system.

Brau, C.A.; Swenson, D.A.; Boyd, T.J. Jr.

1979-11-02T23:59:59.000Z

466

Electronics & Telecommunications Programs and Projects  

Science Conference Proceedings (OSTI)

... nanostructured materials. In the phenomenon … more. Electronic Kilogram Last Updated Date: 06/25/2013 This project ...

2010-09-20T23:59:59.000Z

467

Opening Remarks: Electronic Book Conference  

Science Conference Proceedings (OSTI)

... no consensus standards for electronic publishing formats, security, and retrieval. ... The Information Technology Laboratory is willing to work with the ...

2010-10-05T23:59:59.000Z

468

Infrastructure for Integrated Electronics Design & ...  

Science Conference Proceedings (OSTI)

Infrastructure for Integrated Electronics Design & Manufacturing (IIEDM) Project. ... designed to support distributed supply chain integration and e ...

2010-11-05T23:59:59.000Z

469

Automated Electron Microscopy Film Scanner  

Renewable Energy; Environmental Technologies. ... film meets high performance specifications at higher electron energies while digital cameras do not; ...

470

Electronic Materials: Books/Articles  

Science Conference Proceedings (OSTI)

FORUMS > ELECTRONIC MATERIALS: BOOKS/ARTICLES, Replies, Views, Originator, Last Post. Search Category: [ advanced search ]. rss feed. Spacer

471

Computing and Electronics Computer Technology  

E-Print Network (OSTI)

Computing and Electronics Technology Computer Technology NetworkManagementoption InformationSystemsManagementoption Computer System Technician Electronics Technology Energy Technology ace.cte.umt.edu www.cte.umt.edu Department of Applied Computing and Electronics Chair: Tom Gallagher Phone: 406.243.7814 Email: Thomas

Crone, Elizabeth

472

High Availability Electronics Standards  

Science Conference Proceedings (OSTI)

Availability modeling of the proposed International Linear Collider (ILC) predicts unacceptably low uptime with current electronics systems designs. High Availability (HA) analysis is being used as a guideline for all major machine systems including sources, utilities, cryogenics, magnets, power supplies, instrumentation and controls. R&D teams are seeking to achieve total machine high availability with nominal impact on system cost. The focus of this paper is the investigation of commercial standard HA architectures and packaging for Accelerator Controls and Instrumentation. Application of HA design principles to power systems and detector instrumentation are also discussed.

Larsen, R.S.; /SLAC

2006-12-13T23:59:59.000Z

473

Optimizing a low-energy electron diffraction spin-polarization analyzer for imaging of magnetic surface structures  

Science Conference Proceedings (OSTI)

A newly designed scanning electron microscope with polarization analysis (SEMPA or spin-SEM) for the acquisition of magnetic images is presented. Core component is the spin detector, based on the scattering of low-energy electrons at a W(100) surface in ultrahigh vacuum. The instrument has been optimized with respect to ease of handling and efficiency. The operation and performance of a general low-energy electron diffraction (LEED) detector for SEMPA have been modeled in order to find the optimum operating parameters and to predict the obtainable image asymmetry. Based on the energy dependence of the secondary electron polarization and intensity, the detector output is simulated. For our instrument with optimized performance we demonstrate experimentally 8.6% polarization asymmetry in the domain structure of an iron whisker. This corresponds to 17.2% image contrast, in excellent agreement with the predicted simulated value. A contrast to noise ratio of 27 is achieved at 5 ms acquisition time per pixel.

Froemter, Robert; Hankemeier, Sebastian; Oepen, Hans Peter [Institut fuer Angewandte Physik, Universitaet Hamburg, Jungiusstr. 11, 20355 Hamburg (Germany); Kirschner, Juergen [Max-Planck-Institut fuer Mikrostrukturphysik, Weinberg 2, 06120 Halle (Germany)

2011-03-15T23:59:59.000Z

474

Vehicle Technologies Office: Power Electronics  

NLE Websites -- All DOE Office Websites (Extended Search)

Power Electronics Power Electronics The power electronics activity focuses on research and development (R&D) for flexible, integrated, modular power electronics for power conditioning and control, including a power switch stage capable of running a variety of motors and loads. Efforts are underway to reduce overall system costs for these vehicles through the elimination of additional cooling loops to keep the power electronics within their safe operation ranges. These challenges are being met within the program through research in: Silicon carbide and Gallium Nitride semiconductors, which can be operated at much higher temperatures than current silicon semiconductors; Packaging innovations for higher temperature operation; Improved thermal control technologies; and

475

Split-illumination electron holography  

Science Conference Proceedings (OSTI)

We developed a split-illumination electron holography that uses an electron biprism in the illuminating system and two biprisms (applicable to one biprism) in the imaging system, enabling holographic interference micrographs of regions far from the sample edge to be obtained. Using a condenser biprism, we split an electron wave into two coherent electron waves: one wave is to illuminate an observation area far from the sample edge in the sample plane and the other wave to pass through a vacuum space outside the sample. The split-illumination holography has the potential to greatly expand the breadth of applications of electron holography.

Tanigaki, Toshiaki; Aizawa, Shinji; Suzuki, Takahiro; Park, Hyun Soon [Advanced Science Institute, RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198 (Japan); Inada, Yoshikatsu [Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Sendai 980-8577 (Japan); Matsuda, Tsuyoshi [Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012 (Japan); Taniyama, Akira [Corporate Research and Development Laboratories, Sumitomo Metal Industries, Ltd., Amagasaki, Hyogo 660-0891 (Japan); Shindo, Daisuke [Advanced Science Institute, RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198 (Japan); Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Sendai 980-8577 (Japan); Tonomura, Akira [Advanced Science Institute, RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198 (Japan); Okinawa Institute of Science and Technology, Graduate University, Onna-son, Okinawa 904-0495 (Japan); Central Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama 350-0395 (Japan)

2012-07-23T23:59:59.000Z

476

Electron Microscopy Center  

NLE Websites -- All DOE Office Websites (Extended Search)

General Information for EMC Users General Information for EMC Users The Electron Microscopy Center (EMC) is an Office of Science User Facility operated for the U.S. Department of Energy Office of Science by Argonne National Laboratory. It is one of three scientific user facilities for electron beam microcharacterization and one of several National User Facilities located at Argonne National Laboratory. As a scientific user facility, the EMC supports user-accessible instruments (Resources) for high spatial resolution microanalysis, field imaging, nanoscale structural characterization, nanoscale fabrication and manipulation, and unique in situ studies of materials under the influence of ion-beam irradiation. These capabilities are used in a diverse variety of research areas to address grand challenge scientific questions encompassing, for example, energy-related studies, biology, astrophysics, archaeology, superconductivity, nanotechnology, environmental engineering, tribology, and ferroelectricity. The research is performed both by users and by EMC staff. While many users work independently, the most challenging research activities require extensive contributions from EMC staff.

477

Electronic security device  

DOE Patents (OSTI)

The present invention relates to a security device having a control box (12) containing an electronic system (50) and a communications loop (14) over which the system transmits a signal. The device is constructed so that the communications loop can extend from the control box across the boundary of a portal such as a door into a sealed enclosure into which access is restricted whereby the loop must be damaged or moved in order for an entry to be made into the enclosure. The device is adapted for detecting unauthorized entries into such enclosures such as rooms or containers and for recording the time at which such entries occur for later reference. Additionally, the device detects attempts to tamper or interfere with the operation of the device itself and records the time at which such events take place. In the preferred embodiment, the security device includes a microprocessor-based electronic system (50) and a detection module (72) capable of registering changes in the voltage and phase of the signal transmitted over the loop.

Eschbach, Eugene A. (Richland, WA); LeBlanc, Edward J. (Kennewick, WA); Griffin, Jeffrey W. (Kennewick, WA)

1992-01-01T23:59:59.000Z

478

Electronic security device  

DOE Patents (OSTI)

The present invention relates to a security device having a control box containing an electronic system and a communications loop over which the system transmits a signal. The device is constructed so that the communications loop can extend from the control box across the boundary of a portal such as a door into a sealed enclosure into which access is restricted whereby the loop must be damaged or moved in order for an entry to be made into the enclosure. The device is adapted for detecting unauthorized entries into such enclosures such as rooms or containers and for recording the time at which such entries occur for later reference. Additionally, the device detects attempts to tamper or interfere with the operation of the device itself and records the time at which such events take place. In the preferred embodiment, the security device includes a microprocessor-based electronic system and a detection module capable of registering changes in the voltage and phase of the signal transmitted over the loop. 11 figs.

Eschbach, E.A.; LeBlanc, E.J.; Griffin, J.W.

1992-03-17T23:59:59.000Z

479

NIST Electron and Optical Physics Division - 2000  

Science Conference Proceedings (OSTI)

... Electron Standing Waves: The electron standing waves produced by scattering of the surface state electrons from step edges and defects on Cu ...

480

Kk electronic A S | Open Energy Information  

Open Energy Info (EERE)

Kk electronic A S Jump to: navigation, search Name kk-electronic AS Place Herning, Denmark Zip DK-7400 Sector Wind energy Product Provides electronic wind turbine controllers....

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


481

FREE-ELECTRON LASERS  

SciTech Connect

We can now produce intense, coherent light at wavelengths where no conventional lasers exist. The recent successes of devices known as free-electron lasers mark a striking confluence of two conceptual developments that themselves are only a few decades old. The first of these, the laser, is a product of the fifties and sixties whose essential characteristics have made it a staple resource in almost every field of science and technology. In a practical sense, what defines a laser is its emission of monochromatic, coherent light (that is, light of a single wavelength, with its waves locked in step) at a wavelength in the infrared, visible, or ultraviolet region of the electromagnetic spectrum. A second kind of light, called synchrotron radiation, is a by-product of the age of particle accelerators and was first observed in the laboratory in 1947. As the energies of accelerators grew in the 1960s and 70s, intense, incoherent beams of ultraviolet radiation and x--rays became available at machines built for high-energy physics research. Today, several facilities operate solely as sources of synchrotron light. Unlike the well-collimated monochromatic light emitted by lasers, however, this incoherent radiation is like a sweeping searchlight--more accurately, like the headlight of a train on a circular track--whose wavelengths encompass a wide spectral band. Now, in several laboratories around the world, researchers have exploited the physics of these two light sources and have combined the virtues of both in a single contrivance, the free-electron laser, or FEL (1). The emitted light is laserlike in its narrow, sharply peaked spectral distribution and in its phase coherence, yet it can be of a wavelength unavailable with ordinary lasers. Furthermore, like synchrotron radiation, but unlike the output of most conventional lasers, the radiation emitted by free-electron lasers can be tuned, that is, its wavelength can be easily varied across a wide range. The promise of this new technology extends from the fields of solid-state physics, gas- and liquid-phase photochemistry, and surface catalysis to futuristic schemes for ultrahigh-energy linear accelerators.

Sessler, A.M.; Vaughan, D.

1986-04-01T23:59:59.000Z

482

Microscopic Measurements of Electrical Potential in Hydrogenated Nanocrystalline Silicon Solar Cells: Preprint  

DOE Green Energy (OSTI)

We report on a direct measurement of electrical potential and field profiles across the n-i-p junction of hydrogenated nanocrystalline silicon (nc-Si:H) solar cells, using the nanometer-resolution potential imaging technique of scanning Kelvin probe force microscopy (SKPFM). It was observed that the electric field is nonuniform across the i layer. It is much higher in the p/i region than in the middle and the n/i region, illustrating that the i layer is actually slightly n-type. A measurement on a nc-Si:H cell with a higher oxygen impurity concentration shows that the nonuniformity of the electric field is much more pronounced than in samples having a lower O impurity, indicating that O is an electron donor in nc-Si:H materials. This nonuniform distribution of electric field implies a mixture of diffusion and drift of carrier transport in the nc-Si:H solar cells. The composition and structure of these nc-Si:H cells were further investigated by using secondary-ion mass spectrometry and Raman spectroscopy, respectively. The effects of impurity and structural properties on the electrical potential distribution and solar cell performance are discussed.

Jiang, C. S.; Moutinho, H. R.; Reedy, R. C.; Al-Jassim, M. M.; Yan, B.; Yue, G.; Sivec, L.; Yang, J.; Guha, S.; Tong, X.