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Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
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1

Background, status and future of the Transmission Electron Aberration-corrected Microscope project  

Science Journals Connector (OSTI)

...Microscope project Recent advances in aberration-correcting...DOEs) Office of Science to jointly design...great interest for aerospace and cryogenic applications...be possible to advance to a new level...heart of materials science. At this level...

2009-01-01T23:59:59.000Z

2

A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope  

Science Journals Connector (OSTI)

......micrographs, ultramicroscopy 15: 151-172. rical pole-piece dimensions. The 200 kV spherical-aberra- 8 Thust A, Overwijk M H F, coene w M J. and Lentzen M (1996) tion-COrreCted microscope avoids the radiation damage Numerical correction of......

Knut Urban; Bernd Kabius; Max Haider; Harald Rose

1999-01-01T23:59:59.000Z

3

Three-Dimensional Aberration-Corrected Scanning Transmission Electron Microscopy for Biology  

SciTech Connect (OSTI)

Recent instrumental developments have enabled greatly improved resolution of scanning transmission electron microscopes (STEM) through aberration correction. An additional and previously unanticipated advantage of aberration correction is the greatly improved depth sensitivity that has led to the reconstruction of a three-dimensional (3D) image from a focal series. In this chapter the potential of aberration-corrected 3D STEM to provide major improvements in the imaging capabilities for biological samples will be discussed. This chapter contains a brief overview ofthe various high-resolution 3D imaging techniques, a historical perspective of the development of STEM, first estimates of the dose-limited axial and lateral resolution on biological samples and initial experiments on stained thin sections.

De Jonge, Niels [ORNL; Sougrat, Rachid [ORNL; Pennycook, Stephen J [ORNL; Peckys, Diana B [ORNL; Lupini, Andrew R [ORNL

2007-01-01T23:59:59.000Z

4

Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems  

Science Journals Connector (OSTI)

...in solving the pressing energy problems facing us today...Discussion Meeting Issue New possibilities with aberration-corrected...Wang), pp.152-191. New York, NY: Springer. Pennycook...and analysis to solving energy problems. | The new possibilities of aberration-corrected...

2009-01-01T23:59:59.000Z

5

Instrument Series: Microscopy Aberration-Corrected Scanning/Transmission  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Aberration-Corrected Aberration-Corrected Scanning/Transmission Electron Microscope EMSL's aberration-corrected Titan 80-300(tm) scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials. Research Applications

6

In-situ Study of Dynamic Phenomena at Metal Nanosolder Interfaces Using Aberration Corrected Scanning Transmission Electron Microcopy.  

SciTech Connect (OSTI)

Controlling metallic nanoparticle (NP) interactions plays a vital role in the development of new joining techniques (nanosolder) that bond at lower processing temperatures but remain viable at higher temperatures. The pr imary objective of this project is t o develop a fundamental understanding of the actual reaction processes, associated atomic mechanisms, and the resulting microstructure that occur during thermally - driven bond formation concerning metal - metal nano - scale (<50nm) interfaces. In this LDRD pr oject, we have studied metallic NPs interaction at the elevated temperatures by combining in - situ transmission electron microscopy (TEM ) using an aberration - corrected scanning transmission electron microscope (AC - STEM) and atomic - scale modeling such as m olecular dynamic (MD) simulations. Various metallic NPs such as Ag, Cu and Au are synthesized by chemical routines. Numerous in - situ e xperiments were carried out with focus of the research on study of Ag - Cu system. For the first time, using in - situ STEM he ating experiments , we directly observed t he formation of a 3 - dimensional (3 - D) epitaxial Cu - Ag core - shell nanoparticle during the thermal interaction of Cu and Ag NPs at elevated temperatures (150 - 300 o C). The reaction takes place at temperatures as low as 150 o C and was only observed when care was taken to circumvent the effects of electron beam irradiation during STEM imaging. Atomic - scale modeling verified that the Cu - Ag core - shell structure is energetically favored, and indicated that this phenomenon is a nano - scale effect related to the large surface - to - volume ratio of the NPs. The observation potentially can be used for developing new nanosolder technology that uses Ag shell as the %22glue%22 that stic ks the particles of Cu together. The LDRD has led to several journal publications and numerous conference presentations, and a TA. In addition, we have developed new TEM characterization techniques and phase - field modeling tools that can be used for future materials research at Sandia. Acknowledgeme nts This work was supported by the Laboratory Directed Research and Development (LDRD) program of Sandia National Laboratories. Sandia National Laboratories is a multi - program laboratory managed and operated by Sandia Corporation, a wholly owned subsidia ry of Lockheed Martin Corporation, for the US Department of Energy's National Nuclear Security Administration under contract DE - AC04 - 94AL85000.

Lu, Ping

2014-10-01T23:59:59.000Z

7

High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy  

Science Journals Connector (OSTI)

...R. F. 1996 Electron energy-loss spectroscopy in...microscope, 2nd edn. New York, NYPlenum. Egerton...Transmission electron energy loss spectrometry in materials...energy-gain spectroscopy. New J. Phys. 10, 1367-2630...

2009-01-01T23:59:59.000Z

8

New views of materials through aberration-corrected scanning transmission electron microscopy  

Science Journals Connector (OSTI)

......analysis to solving energy problems. Phil...eds. (2007) New York: Springer...and electron energy loss spectroscopy...eds. (2011) New York: Springer...for electron energy loss spectroscopy...can now give new insights into......

S. J. Pennycook; M. Varela

2011-08-01T23:59:59.000Z

9

Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging  

SciTech Connect (OSTI)

Based on the evaluation of lattice parameter maps in aberration corrected high resolution transmission electron microscopy images, we propose a simple method that allows quantifying the composition and disorder of a semiconductor alloy at the unit cell scale with high accuracy. This is realized by considering, next to the out-of-plane, also the in-plane lattice parameter component allowing to separate the chemical composition from the strain field. Considering only the out-of-plane lattice parameter component not only yields large deviations from the true local alloy content but also carries the risk of identifying false ordering phenomena like formations of chains or platelets. Our method is demonstrated on image simulations of relaxed supercells, as well as on experimental images of an In{sub 0.20}Ga{sub 0.80}N quantum well. Principally, our approach is applicable to all epitaxially strained compounds in the form of quantum wells, free standing islands, quantum dots, or wires.

Schulz, T.; Remmele, T.; Korytov, M.; Markurt, T.; Albrecht, M. [Leibniz-Institut für Kristallzüchtung, Max-Born-Straße 2, 12489 Berlin (Germany); Duff, A.; Lymperakis, L.; Neugebauer, J. [Max-Planck-Institut für Eisenforschung, Max-Planck-Straße 1, 40237 Düsseldorf (Germany); Chèze, C. [TopGaN Sp. z o.o., Sokolowska 29/37, 01-142 Warsaw (Poland); Skierbiszewski, C. [TopGaN Sp. z o.o., Sokolowska 29/37, 01-142 Warsaw (Poland); Institute of High Pressure Physics, Polish Academy of Sciences, Sokolowska 29/37, 01-142 Warsaw (Poland)

2014-01-21T23:59:59.000Z

10

High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy  

Science Journals Connector (OSTI)

...equal to the beam current per unit area per unit solid angle per unit energy interval, CFE electron sources with their...Monochromated, spatially resolved electron energy-loss spectroscopic measurements of gold nanoparticles in the plasmon range...

2009-01-01T23:59:59.000Z

11

Progress on PEEM3 - An Aberration Corrected X-Ray Photoemission Electron Microscope at the ALS  

E-Print Network [OSTI]

Correctors Objective lens Sample Puck UHV Sub-chamber Samplebellows. Ultra High Vacuum (UHV) is required for the samplerather large instrument to UHV we have adopted localized UHV

2006-01-01T23:59:59.000Z

12

Transmission Electron Microscope and Scanning Electron Microscopes -  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Facilities > Transmission Electron Facilities > Transmission Electron Microscope and Scanning Electron Microscopes FACILITIES Transmission Electron Microscope and Scanning Electron Microscopes Overview Other Facilities Work with Argonne Contact us For Employees Site Map Help Join us on Facebook Follow us on Twitter NE on Flickr Transmission Electron Microscope and Scanning Electron Microscopes The research activities of the Corrosion and Mechanics of Materials Section are supported by complete metallography/sample preparation rooms equipped with several optical and electron microscopes: a Transmission Electron Microscope and two Scanning Electron Microscopes. Bookmark and Share Transmission electron microscope (TEM) Detail of JEOL 100CXII TEM Figure 1: Detail of JEOL 100CXII TEM. Click on image to view larger image.

13

Adaptive aberration correction in a confocal microscope  

Science Journals Connector (OSTI)

...corresponds to a restoration of the axial sectioning...degradation and restoration of the axial resolution...of the adaptive system in imaging biological...cycle, the laser power was reduced to...the experimental system allowed visualization...B , ed( 1995 ) Handbook of Biological Confocal...

Martin J. Booth; Mark A. A. Neil; Rimas Juškaitis; Tony Wilson

2002-01-01T23:59:59.000Z

14

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

0.5 0.5 The TEAM 0.5 microscope is a double-aberration-corrected (scanning) transmission electron microscope (STEM/TEM) capable of producing images with 50 pm resolution. The basic instrument is a modified FEI Titan 80-300 microscope equipped with a special high-brightness Schottky-field emission electron source, a gun monochromator, a high-resolution GIF Tridiem energy-filter, and two CEOS hexapole-type spherical aberration correctors. The illumination aberration corrector corrects coherent axial aberrations up to 4th order, as well as 5th order spherical aberration and six-fold astigmatism. The imaging aberration corrector fully corrects for coherent axial aberrations up to 3rd order and partially compensates for 4th and 5th order aberrations. The microscope has two 2048x2048 slow-scan CCD

15

Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy  

Science Journals Connector (OSTI)

......microscope. Phil. Trans. R. Soc. A (2009) 367...Szilagyi Z S, Lupini A R, Borisevich A, Sides W H Jr, Pennycook S J. Direct...1063/1.3225103 . 32 McNally J G , Karpova T, Cooper...33 De Jonge N , Sougrat R, Northan B M, Pennycook......

Xiaobin Zhang; Masaki Takeguchi; Ayako Hashimoto; Kazutaka Mitsuishi; Peng Wang; Peter D. Nellist; Angus I. Kirkland; Meguru Tezuka; Masayuki Shimojo

2012-06-01T23:59:59.000Z

16

Electron Microscope Facility  

ScienceCinema (OSTI)

Brookhaven Lab is home to one of only a few Scanning Transmision Electron Microscope (STEM) machines in the world and one of the few that can image single heavy atoms.

None

2010-01-08T23:59:59.000Z

17

Electron microscope studies  

SciTech Connect (OSTI)

This year our laboratory has continued to make progress in the design of electron-optical systems, in the study of structure-function relationships of large multi-subunit proteins, in the development of new image processing software and in achieving a workable sub-angstrom STEM. We present an algebraic approach to the symmetrical Einzel (unipotential) lens wherein we simplify the analysis by specifying a field shape that meets some preferred set of boundary or other conditions and then calculate the fields. In a second study we generalize this approach to study of three element electrostatic lenses of which the symmetrical Einzel lens is a particular form. The purpose is to develop a method for assisting in the design of a lens for a particular purpose. In our biological work we study a stable and functional dodecameric complex of globin chains from the hemoglobin of Lumbricus terrestris. This is a complex lacking the linker'' subunit first imaged in this lab and required for maintenance of the native structure. In addition, we do a complete work-up on the hemoglobin of the marine polychaete Eudistylia vancouverii demonstrating the presence of a hierarchy of globin complexes. We demonstrate stable field-emission in the sub-angstrom STEM and the preliminary alignment of the beam. We continue our exploration of a algorithms for alignment of sequences of protein and DNA. Our computer facilities now include four second generation RISC workstations and we continue to take increasing advantage of the floating-point and graphical performance of these devices.

Crewe, A.V.; Kapp, O.H.

1991-06-01T23:59:59.000Z

18

Exploring aberration-corrected electron microscopy for compound semiconductors  

Science Journals Connector (OSTI)

......at atomic dimensions. Cryst. Res. Technol. (2005) 40:149-160. doi:10.1002/crat.200410318 . 26 Thust A , Overwijk M H F, Coene W M N, Lentzen M. Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy (1996......

David J. Smith; Toshihiro Aoki; John Mardinly; Lin Zhou; Martha R. McCartney

2013-06-01T23:59:59.000Z

19

Electron microscopy and microanalysis Two transmission electron microscopes  

E-Print Network [OSTI]

Electron microscopy and microanalysis Two transmission electron microscopes (TEM) and three scanning electron micro- scopes (SEM) are operated by the De- partment. Attachments for TEM include energy dispersive X-ray spectrometer (EDS), scanning transmission attachment, serial electron energy loss

20

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

iTEAM iTEAM The in situ Transmission Electron Aberration Corrected Microscope (iTEAM) is a proposed project to develop a microscope with powerful capabilities for in situ studies of materials in their native environment. iTEAM will build on the success of the TEAM project by utilizing both spherical and chromatic aberration correction in an electron microscope to provide unprecedented capabilities to study materials in controlled environments of temperature, pressure, or fluidic states with the high-resolution in imaging, diffraction, and spectroscopy typical of electron probes. The capabilities of iTEAM will lead to new ways to understand the behavior of materials in native environments, with particular relevance to major energy initiatives such as catalysis, solar conversion, fuel cells, and batteries. In addition, iTEAM will provide new capabilities to understand organic/inorganic interfaces, functionalized nanoparticles, and biomaterials under natural conditions.

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


21

Instrument Series: Microscopy Environmental Transmission Electron Microscope  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Environmental Transmission Environmental Transmission Electron Microscope EMSL's environmental transmission electron microscope (ETEM) provides in situ capabilities that enable atomic-resolution imaging and spectroscopic studies of materials under dynamic operating conditions. In contrast to traditional operation of TEM under high vacuum, EMSL's ETEM uniquely allows imaging within high- temperature and gas environments-with a gas pressure up to 20 Torr. With a spherical aberration corrector for the objective lens, the ETEM captures atomic-level processes as they occur, enabling vital research across a range of scientific fields. Research Applications Chemical science and engineering - providing in situ observation of catalytic processes with atomic-level resolution Materials science and engineering - allowing

22

A transmission electron microscope for lecture demonstrations  

Science Journals Connector (OSTI)

A simple transmission electron microscope (TEM) suitable for lecture demonstrations is described. In this TEM electrons are created in a glow discharge between two parallel electrodes in air at a reduced pressure. The electrons are collimated by a small hole in the anode focused by a solenoid that acts as an electromagnetic lens and imaged on a thin layer of phosphor deposited inside an Erlenmeyer flask. An image of a biological sample placed between the source and the lens can be magnified about 20 times. The microscope uses inexpensive components that can be quickly assembled during a demonstration. The TEM provides a visual and memorable display that highlights phenomena such as mean-free-path charged particle optics electrical discharges and cathodoluminescence.

J. A. Panitz; Gertrude Rempfer

2006-01-01T23:59:59.000Z

23

Ponderomotive phase plate for transmission electron microscopes  

DOE Patents [OSTI]

A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.

Reed, Bryan W. (Livermore, CA)

2012-07-10T23:59:59.000Z

24

High resolution electron microscopic studies on ferrosilite III  

Science Journals Connector (OSTI)

High resolution transmission electron microscopic (HRTEM) studies on ferrosilite (Fs) III confirmed the periodicity nine (p=9) of the tetrahedral chains in this silicate. Various chain periodicit...

M. Czank; B. Simons

1983-05-01T23:59:59.000Z

25

Electron Microscopy | Center for Functional Nanomaterials  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Microscopy Facility Electron Microscopy Facility Electron Microscopy This facility consists of four top-of-the line transmission electron microscopes, two of which are highly specialized instruments capable of extreme levels of resolution, achieved through spherical aberration correction. The facility is also equipped with extensive sample-preparation capabilities. The scientific interests of the staff focus on understanding the microscopic origin of the physical and chemical behavior of materials, with specific emphasis on in-situ studies of materials in native, functional environments. Capabilities Atomic-resolution imaging of internal materials structure with scanning transmission and transmission electron microscopy Spectroscopic characterization with energy dispersive x-ray

26

Atomic Resolution Coordination Mapping in Ca2FeCoO5 Brownmillerite by Spatially Resolved Electron Energy-Loss Spectroscopy  

Science Journals Connector (OSTI)

Using a combination of high-angle annular dark field scanning transmission electron microscopy and atomically resolved electron energy-loss spectroscopy at high energy resolution in an aberration-corrected electron microscope, we demonstrate the capability of coordination mapping in complex oxides. ... (b) Survey image indicating the area used for octahedral (red) and tetrahedral (blue) data summation (3 pixel width). ... B atoms that have energetic preference for tetrahedral coordination geometry are esp. ...

Stuart Turner; Johan Verbeeck; Farshid Ramezanipour; John E. Greedan; Gustaaf Van Tendeloo; Gianluigi A. Botton

2012-04-25T23:59:59.000Z

27

Simultaneous STM and UHV electron microscope observation of silicon nanowires extracted from Si(111) surface  

Science Journals Connector (OSTI)

......research-article Articles Simultaneous STM and UHV electron microscope observation of silicon...silicon|tungsten| Simultaneous STM and UHV electron microscope observation of silicon...Semiconductor Special Issue Simultaneous STM and UHV electron microscope observation of silicon......

Y. Naitoh; K. Takayanagi; Y. Oshima; H. Hirayama

2000-01-01T23:59:59.000Z

28

Human Prostatic Carcinoma: An Electron Microscope Study  

Science Journals Connector (OSTI)

...knives on a Porter-Blum micro tome. The ultrathin...believe that these droplets arc of heterogeneous nature...15. - ". Fatty Acid Oxidation in Normal and Neoplastic...Sectioning in Electron Micros copy. Stain Technol...Sections for Electron Micros copy. J. Biophys...

Peter Mao; Komei Nakao; and Alfred Angrist

1966-05-01T23:59:59.000Z

29

Vibration Proof Construction of 1000kV Electron Microscope  

Science Journals Connector (OSTI)

......University Press 1970 other ORIGINAL Vibration Proof Construction of 1000kV Electron...with the center of gravity. That is, a vibration proof hanging console was made as a method...protecting a 1000kV Electron Microscope from vibration, and this allowed the whole instrument......

Yoshio SAKITANI; Susumu OZASA

1970-01-01T23:59:59.000Z

30

Transcranial phase aberration correction using beam simulations and MR-ARFI  

SciTech Connect (OSTI)

Purpose: Transcranial magnetic resonance-guided focused ultrasound surgery is a noninvasive technique for causing selective tissue necrosis. Variations in density, thickness, and shape of the skull cause aberrations in the location and shape of the focal zone. In this paper, the authors propose a hybrid simulation-MR-ARFI technique to achieve aberration correction for transcranial MR-guided focused ultrasound surgery. The technique uses ultrasound beam propagation simulations with MR Acoustic Radiation Force Imaging (MR-ARFI) to correct skull-caused phase aberrations. Methods: Skull-based numerical aberrations were obtained from a MR-guided focused ultrasound patient treatment and were added to all elements of the InSightec conformal bone focused ultrasound surgery transducer during transmission. In the first experiment, the 1024 aberrations derived from a human skull were condensed into 16 aberrations by averaging over the transducer area of 64 elements. In the second experiment, all 1024 aberrations were applied to the transducer. The aberrated MR-ARFI images were used in the hybrid simulation-MR-ARFI technique to find 16 estimated aberrations. These estimated aberrations were subtracted from the original aberrations to result in the corrected images. Each aberration experiment (16-aberration and 1024-aberration) was repeated three times. Results: The corrected MR-ARFI image was compared to the aberrated image and the ideal image (image with zero aberrations) for each experiment. The hybrid simulation-MR-ARFI technique resulted in an average increase in focal MR-ARFI phase of 44% for the 16-aberration case and 52% for the 1024-aberration case, and recovered 83% and 39% of the ideal MR-ARFI phase for the 16-aberrations and 1024-aberration case, respectively. Conclusions: Using one MR-ARFI image and noa priori information about the applied phase aberrations, the hybrid simulation-MR-ARFI technique improved the maximum MR-ARFI phase of the beam's focus.

Vyas, Urvi, E-mail: urvi.vyas@gmail.com; Kaye, Elena; Pauly, Kim Butts [Department of Radiology, Stanford University, Stanford, California 94305 (United States)] [Department of Radiology, Stanford University, Stanford, California 94305 (United States)

2014-03-15T23:59:59.000Z

31

Nanomanipulation of biological samples using a compact atomic force microscope under scanning electron microscope observation  

Science Journals Connector (OSTI)

......Leakage of the EB current to the micro-electric circuit of the piezo-resistive sensor...Science and Technology, Development of elementary techniques for electron microscope in...Superfine R, Washburn S. In situ resistance measurements of strained carbon nanotubes......

Futoshi Iwata; Yuya Mizuguchi; Hideyuki Ko; Tatsuo Ushiki

2011-12-01T23:59:59.000Z

32

Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems  

Science Journals Connector (OSTI)

...fuels, but the conversion efficiency of...into electrical energy is limited by...functionality in energy conversion devices such as...insights into the carrier dynamics in the...ability to study energy conversion processes in materials...

2009-01-01T23:59:59.000Z

33

Measurement of Semiconductor Surface Potential using the Scanning Electron Microscope  

SciTech Connect (OSTI)

We calibrate the secondary electron signal from a standard scanning electron microscope to voltage, yielding an image of the surface or near-surface potential. Data on both atomically abrupt heterojunction GaInP/GaAs and diffused homojunction Si solar cell devices clearly show the expected variation in potential with position and applied bias, giving depletion widths and locating metallurgical junctions to an accuracy better than 10 nm. In some images, distortion near the p-n junction is observed, seemingly consistent with the effects of lateral electric fields (patch fields). Reducing the tube bias removes this distortion. This approach results in rapid and straightforward collection of near-surface potential data using a standard scanning electron microscope.

Heath, J. T.; Jiang, C. S.; Al-Jassim, M. M.

2012-02-15T23:59:59.000Z

34

E-Print Network 3.0 - analytical electron microscope Sample Search...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

two-contact electrical biasing specimen holder for electron holography and electron tomography of semiconductor devices Summary: in an electron microscope", which allows high...

35

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

AEM AEM AEME The Analytical Electron Microscope is optimized for elemental microanalysis. The basic instrument is a JEOL 200CX microscope with a side-entry double-tilt goniometer stage and an assortment of specimen holders. This machine can be operated at between 80 and 200 kV in the TEM or STEM mode. Electron energy loss and x-ray signals for elemental microanalysis or spectral imaging can be collected either separately or simultaneously using probe diameters from 6nm to 100nm. Diffraction modes include convergent beam diffraction for three-dimensional structure information and micro-diffraction with a minimum probe size of 20nm. For updates or details, contact Zonghoon Lee or Velimir Radmilovic. The instrument is equipped with two Kevex EDXS detectors and a Gatan PEELS

36

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

LIBRA LIBRA The 200kV Zeiss monochromated LIBRA 200MC is designed to produce high contrast imaging for TEM and STEM and either convergent beam or parallel beam diffraction using Koehler illumination.In addition, the incorporation of a monochromator into the field emission gun enables energy resolution of ~0.15eV for electron energy loss spectroscopy. The dedicated in-column Omega Filter implemented in this microscope also can be used for both spectroscopic analysis and energy-filtered imaging with a 2048x2048 CCD camera. The high tilt capability of the stage and pole piece accepts various types of analytical holders.This microscope is optimized for soft materials applications that require either the high contrast imaging performance or analytical methods such as EF-TEM and STEM.( Instrument

37

The early history of the scanning electron microscope  

Science Journals Connector (OSTI)

The article begins with an account of prewar German work particularly that of von Ardenne who established the theoretical basis of a scanning electron microscope and constructed an instrument which was primarily intended to overcome chromatic aberration when relatively thick specimens were examined by transmission. Neither this microscope nor a different one built a few years later in the U. S. A. attained sufficient resolution to gain acceptance and the reasons for this are examined. The remainder of the article deals with work carried out in the Cambridge University Engineering Department over the years from 1948 to about 1965 when the first successful commercial instrument was produced. The contributions made by successive research students are explained as are also the nonscientific factors which influenced the course of the development.

C. W. Oatley

1982-01-01T23:59:59.000Z

38

In situ laser processing in a scanning electron microscope  

SciTech Connect (OSTI)

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {micro}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas [University of Tennessee, Knoxville (UTK); Fowlkes, Jason Davidson [ORNL; Rack, Prof. Philip [University of Tennessee, Knoxville (UTK); Moore, Tom [OmniProbe, Inc.; Magel, Greg [OmniProbe, Inc.; Hartfield, Cheryl [OmniProbe, Inc.

2012-01-01T23:59:59.000Z

39

In situ laser processing in a scanning electron microscope  

SciTech Connect (OSTI)

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {mu}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

Roberts, Nicholas A.; Magel, Gregory A.; Hartfield, Cheryl D.; Moore, Thomas M.; Fowlkes, Jason D.; Rack, Philip D. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

2012-07-15T23:59:59.000Z

40

Integrated windows-based control system for an electron microscope  

SciTech Connect (OSTI)

A Windows application has been developed for management and operation of beam instruments such as electron or ion microscopes. It provides a facility that allows an operator to manage a complicated instrument with minimal effort, primarily under mouse control. The hardware control components used on similar instruments (e.g., the scanning transmission electron microscopes in our lab), such as toggles, buttons, and potentiometers for adjustments on various scales, are all replaced by the controls of the Windows application and are addressable on a single screen. The new controls in this program (via adjustable software settings) offer speed of response and smooth operation providing tailored control of various instrument parameters. Along with the controls offering single parameter adjustment, a two-dimensional control was developed that allows two parameters to be coupled and addressed simultaneously. This capability provides convenience for such tasks as finding the beam'' and directing it to a location of interest on the specimen. Using an icon-based display, this Windows application provides better integrated and more robust information for monitoring instrument status than the indicators and meters of the traditional instrument controls. As a Windows application, this program is naturally able to share the resources of the Windows system and is thus able to link to many other applications such as our image acquisition and processing programs. Computer control provides automatic protection and instant diagnostics for the experimental instrument. This Windows application is fully functional and is in daily use to control a new type of electron microscope developed in our lab.

Ruan, S. (The Enrico Fermi Institute, The University of Chicago, Chicago, Illinois 60637 (United States)); Kapp, O.H. (The Department of Radiology and The Enrico Fermi Institute, The University of Chicago, Chicago, Illinois 60637 (United States))

1994-12-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


41

Miniature self-contained vacuum compatible electronic imaging microscope  

DOE Patents [OSTI]

A vacuum compatible CCD-based microscopic camera with an integrated illuminator. The camera can provide video or still feed from the microscope contained within a vacuum chamber. Activation of an optional integral illuminator can provide light to illuminate the microscope subject. The microscope camera comprises a housing with a objective port, modified objective, beam-splitter, CCD camera, and LED illuminator.

Naulleau, Patrick P. (Oakland, CA); Batson, Phillip J. (Alameda, CA); Denham, Paul E. (Crockett, CA); Jones, Michael S. (San Francisco, CA)

2001-01-01T23:59:59.000Z

42

Optimal tilt magnitude determination for aberration-corrected super resolution exit wave function reconstruction  

Science Journals Connector (OSTI)

...Experimental high resolution electron microscopy, 3rd edn. Oxford, UK: Oxford University Press. Thust, A. , M. F. Overwijk, W. J. Coene, and M. Lentzen 1996 Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy...

2009-01-01T23:59:59.000Z

43

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Specimen Preparation Specimen Preparation Preparation of samples with large transparent areas and flat surfaces is a key element of electron microscopy. In particular, the interpretation of lattice or holographic images is often limited by the sample's geometry and surface roughness. These parameters are largely determined by a particular sample preparation procedure. The increasing demand for microscopes with a spatial resolution of better than 1Ã… increases the need for improved sample preparation techniques. A substantial effort at NCEM is devoted to the development of reliable and specialized thinning techniques. Current programs explore the application of chemicals to shape the surfaces of thin films, the use of nanospheres for observation of small particles, and the

44

Dynamics of a nanodroplet under a transmission electron microscope  

SciTech Connect (OSTI)

We investigate the cyclical stick-slip motion of water nanodroplets on a hydrophilic substrate viewed with and stimulated by a transmission electron microscope. Using a continuum long wave theory, we show how the electrostatic stress imposed by non-uniform charge distribution causes a pinned convex drop to deform into a toroidal shape, with the shape characterized by the competition between the electrostatic stress and the surface tension of the drop, as well as the charge density distribution which follows a Poisson equation. A horizontal gradient in the charge density creates a lateral driving force, which when sufficiently large, overcomes the pinning induced by surface heterogeneities in the substrate disjoining pressure, causing the drop to slide on the substrate via a cyclical stick-slip motion. Our model predicts step-like dynamics in drop displacement and surface area jumps, qualitatively consistent with experimental observations.

Leong, Fong Yew, E-mail: leongfy@ihpc.a-star.edu.sg [A-STAR Institute of High Performance Computing, 1 Fusionopolis Way, Connexis, Singapore 138632 (Singapore); Mirsaidov, Utkur M. [Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117551 (Singapore); Center for BioImaging Sciences, National University of Singapore, Science Drive 4, Singapore 117543 (Singapore); Matsudaira, Paul [Center for BioImaging Sciences, National University of Singapore, Science Drive 4, Singapore 117543 (Singapore); MechanoBiology Institute, National University of Singapore, 5A Engineering Drive 1, Singapore 117411 (Singapore); Department of Biological Sciences, National University of Singapore, 14 Science Drive 4, Singapore 117543 (Singapore); Singapore-MIT Alliance for Research and Technology Center, Science Drive 2, Singapore 117543 (Singapore); Mahadevan, L. [School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138, USA and Department of Physics, Harvard University, Cambridge, Massachusetts 02138 (United States)

2014-01-15T23:59:59.000Z

45

Low-energy electron microscope of novel design  

Science Journals Connector (OSTI)

We describe the design of an electron emission microscope capable of imaging a sample surface with low-energy electrons reflected from it or with UV photoelectrons. In the primary beam column provision is made to compensate the energy dispersion of the beam-separating magnet and to be able to choose different primary and secondary beam energies for Auger analysis. The secondary beam column comprises a spherical condenser sector field as energy filter. In order to avoid image aberrations caused by the two sector fields, linked imaging is provided so that intermediate surface images are formed in the deflection centers of the sector fields, while the energy selection is done at pupil positions. The emission lens is an electrostatic tetrode. The electrodes are shaped so as to accommodate an optical Schwarzschild-type mirror objective for visual in-situ observation or UV irradiation of the sample surface. A lateral resolution of about 10 nm is expected with UV photoemission microscopy and somewhat better with reflected electron microscopy.

H. Liebl; B. Senftinger

1991-01-01T23:59:59.000Z

46

Compact cryogenic Kerr microscope for time-resolved studies of electron spin transport in microstructures  

E-Print Network [OSTI]

Compact cryogenic Kerr microscope for time-resolved studies of electron spin transport A compact cryogenic Kerr microscope for operation in the small volume of high-field magnets is described-temperature optical microscope, elec- tromagnet and cryogenic cell with cold finger to measure continuous-wave cw

van der Wal, Caspar H.

47

Attainable Resolution of Energy-Selecting Image Using High-Voltage Electron Microscope  

Science Journals Connector (OSTI)

......mapping using an imaging energy filter: Image formation...elemental mapping In an energy filtering transmission...Egerton RF: Electron energy-loss spectroscopy In the electron microscope. New York and London: Plenum Press......

Hiroki Kurata; Sakumi Moriguchi; Seiji Isoda; Takashi Kobayashi

1996-02-01T23:59:59.000Z

48

Fast Image Drift Compensation in Scanning Electron Microscope Using Image Registration  

E-Print Network [OSTI]

Fast Image Drift Compensation in Scanning Electron Microscope Using Image Registration Naresh Marturi, Sounkalo Demb´el´e and Nadine Piat Abstract-- Scanning Electron Microscope (SEM) image ac analysis and characterization of materials to recover their structural, mechanical, electrical and optical

Boyer, Edmond

49

Preparation of Micro-grid for the Electron Microscopic Observation with High Magnification  

Science Journals Connector (OSTI)

......1958 letter LETTER Preparation of Micro-grid for the Electron Microscopic Observation...Japan L E T T E R Preparation of Micro-grid for the Electron Microscopic Observation...call this collodion net-work a micro-grid. Procedure of preparation (1......

S. Sakata

1958-01-01T23:59:59.000Z

50

Four generations of high-voltage electron microscopes  

Science Journals Connector (OSTI)

......microscopes 307 Table 3 Edge lengths of elementary cubes. a0, and separations...data were obtained by electrical resistance measurements [41,42], those...measure- ment of the residual electric resistance using 'conven- tional' accelerator......

Alfred Seeger

1999-01-01T23:59:59.000Z

51

Aberration-corrected electron microscopy of MnAs and As nanocrystals and voids in annealed (Ga,Mn)As  

E-Print Network [OSTI]

were grown at 270 °C using an As2 flux generated by a DCA valve cracker effusion cell with an As aberration coefficient (Cs) was used. The beam convergence semi-angle used for STEM was 15.7 mrad. The inner

Dunin-Borkowski, Rafal E.

52

ELECTRON MICROSCOPE STUDIES OF THE MECHANISM OF NUCLEATION AND GROWTH OF Cu Au II FROM THE DISORDERED STATE  

E-Print Network [OSTI]

846. ELECTRON MICROSCOPE STUDIES OF THE MECHANISM OF NUCLEATION AND GROWTH OF Cu Au II FROM the electron microscope. The alloy is disordered by annealing at 450 °C, and the nucleation and growth with the electron microscope by Ogawa and al. [1], and subsequently by Pashley and co-workers [2], [3], [4

Boyer, Edmond

53

Nanoprobe cathodoluminescence scanning electron microscope as applied to synthesized diamond  

Science Journals Connector (OSTI)

......attention to applications in active and passive electronics...electron gun of thermionic cathode. Since the light emitted...FESEM are: (i) the cathode is operated at room temperature...light emission from the cathode; and (ii) an electron...photon counting system. materials emitting weak CL so long......

Hiroshi Matsuo; Shogo Awata; Yoshihide Kimura; Ryuichi Shimizu

1999-01-01T23:59:59.000Z

54

In-line electron holography with an atomic focuser source  

Science Journals Connector (OSTI)

The resolution that may be achieved in an image formed by reconstruction from an in-line electron hologram, without aberration correction, is governed by the source size. Computer simulations show that ultrahigh resolution, of better than 0.05 nm for 100 keV electrons, may be possible if the electron source is a crossover formed at the exit face of a thin atomic-focuser crystal when electrons from a beam focused in a scanning transmission electron microscope (STEM) instrument are channeled along a line of atoms through the crystal. Simulations also show that, because of the channeling effect, the resolution of the reconstructed image is not degraded by translations or oscillations of the STEM beam by 0.1 nm or more. We suggest a scheme for removing the unwanted background and conjugate image from the reconstructed image by combining the in-line holography with an off-axis mode.

V. V. Smirnov and J. M. Cowley

2002-01-23T23:59:59.000Z

55

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

CM 200 FEG CM 200 FEG AEME The Philips CM200/FEG is a versatile instrument that is designed for analysis of the physical, chemical and magnetic microstructure at high spatial resolution. In addition to high resolution imaging capability, the machine is optimized for analytical electron microscopy and Lorentz imaging, under normal as well as dynamic conditions of variable temperature (77K - 1250K) and applied magnetic fields. Spatially resolved compositional analysis by X-ray emission spectroscopy (Z > 5), local electronic structure measurements by electron energy-loss spectroscopy (Z > 2), convergent beam electron diffraction for three-dimensional structure information, and energy-filtered imaging at the nanometer scale are some of the techniques available on this instrument. In addition, a TEM differential phase

56

CFN | Hitachi HD2700C Scanning Transmission Electron Microscope  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

spectroscopy (EELS) can be as small as 0.35 eV, due to its cold field emission electron gun (FEG) and the presence of a high-resolution parallel EELS detector (Gatan Enfina-ER)....

57

Aberration-Coreected Electron Microscopy at Brookhaven National Laboratory  

SciTech Connect (OSTI)

The last decade witnessed the rapid development and implementation of aberration correction in electron optics, realizing a more-than-70-year-old dream of aberration-free electron microscopy with a spatial resolution below one angstrom [1-9]. With sophisticated aberration correctors, modern electron microscopes now can reveal local structural information unavailable with neutrons and x-rays, such as the local arrangement of atoms, order/disorder, electronic inhomogeneity, bonding states, spin configuration, quantum confinement, and symmetry breaking [10-17]. Aberration correction through multipole-based correctors, as well as the associated improved stability in accelerating voltage, lens supplies, and goniometers in electron microscopes now enables medium-voltage (200-300kV) microscopes to achieve image resolution at or below 0.1nm. Aberration correction not only improves the instrument's spatial resolution but, equally importantly, allows larger objective lens pole-piece gaps to be employed thus realizing the potential of the instrument as a nanoscale property-measurement tool. That is, while retaining high spatial resolution, we can use various sample stages to observe the materials response under various temperature, electric- and magnetic- fields, and atmospheric environments. Such capabilities afford tremendous opportunities to tackle challenging science and technology issues in physics, chemistry, materials science, and biology. The research goal of the electron microscopy group at the Dept. of Condensed Matter Physics and Materials Science and the Center for Functional Nanomaterials, as well as the Institute for Advanced Electron Microscopy, Brookhaven National Laboratory (BNL), is to elucidate the microscopic origin of the physical- and chemical-behavior of materials, and the role of individual, or groups of atoms, especially in their native functional environments. We plan to accomplish this by developing and implementing various quantitative electron microscopy techniques in strongly correlated electron systems and nanostructured materials. As a first step, with the support of Materials Science Division, Office of Basic Energy Science, US Department of Energy, and the New York State Office of Science, Technology, and Academic Research, recently we acquired three aberration-corrected electron microscopes from the three major microscope manufacturers, i.e., JEOL, Hitachi, and FEI. The Hitachi HD2700C is equipped with a probe corrector, the FEI Titan 80-300 has an imaging corrector, while the JEOL2200MCO has both. All the correctors are of the dual-hexapole type, designed and manufactured by CEOS GmbH based on the design due to Rose and Haider [3, 18]. All these three are one-of-a-kind in the US, designed for specialized capabilities in characterizing nanoscale structure. In this chapter, we review the performance of these state-of-the art instruments and the new challenges associated with the improved spatial resolution, including the environment requirements of the laboratory that hosts these instruments. Although each instrument we describe here has its own strengths and drawbacks, it is not our intention to rank them in terms of their performance, especially their spatial resolution in imaging.

Zhu,Y.; Wall, J.

2008-04-01T23:59:59.000Z

58

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

SPLEEM SPLEEM Publications Imaging Spin Reorientation Transitions in Consecutive Atomic Co layers, Farid El Gabaly, Silvia Gallego, M. Carmen Munoz, Laszlo Szunyogh, Peter Weinberger, Kevin F. McCarty, Christof Klein, Andreas K. Schmid, Juan de la Figuera, submitted Direct imaging of spin-reorientation transitions in ultra-thin Ni films by spin-polarized low-energy electron microscopy, C. Klein, A. K. Schmid, R. Ramchal, and M. Farle, submitted Controlling the kinetic order of spin-reorientation transitions in Ni/Cu(100) films by tuning the substrate step-structure, C. Klein, R. Ramchal, A.K. Schmid, M. Farle, submitted Self-organization and magnetic domain microstructure of Fe nanowire arrays, N. Rougemaille and A.K. Schmid, submitted Self-Assembled Nanofold Network Formation on Layered Crystal Surfaces

59

Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope  

Science Journals Connector (OSTI)

......defocus-modulation image processing. Ultramiaysco/y'41: 323-333. means of an appropriate monochromator. 24 Thust A, Overwijk M H, Coene W M J, and Lentzen M (1996) M. Haider et al. Corrected electron microscope 405 Numerical correction of lenaberrations......

Maximilian Haider; Herald Rose; Stephan Uhlemann; Bernd Kabius; Knut Urban

1998-01-01T23:59:59.000Z

60

materials analysis of inorganic, organic, and bioma-terials. See ELECTRON MICROSCOPE.  

E-Print Network [OSTI]

28 Plaster materials analysis of inorganic, organic, and bioma- terials. See ELECTRON MICROSCOPE: The next chip-scale technology, Mater. Today, 9:20­27, 2006. Plaster A plastic mixture of solids and water plaster is also used in the industry to designate plaster of paris. Plaster is usually applied in one

Anderson, Peter M.

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


61

Development of a new 3 MV ultra-high voltage electron microscope at Osaka University  

Science Journals Connector (OSTI)

......shown in Fig. 3 and the main specifications are summarized in Table 1...CW-rircuits at 3MV Main specifications of 3MV electron microscope...stage XI38 stages (at 3MV) InsuLation gas : SFft (4 atoms) Illuminating...This helps to minimize thermal drift of the specimen during......

Akio Takaoka; Katsumi Ura; Hirotaro Mori; Teiji Katsuta; Isao Matsui; Soichiro Hayashi

1997-01-01T23:59:59.000Z

62

Microcalorimeter-type energy dispersive X-ray spectrometer for a transmission electron microscope  

Science Journals Connector (OSTI)

......Microscopy (1986) New York: Plenum Press. 4...Garratt-Reed A J , Bell D C. Energy-Dispersive X-ray...Microscopy (1996) New York: Plenum Press. 19...Microcalorimeter-type energy dispersive X-ray...electron microscope. | A new energy dispersive......

Toru Hara; Keiichi Tanaka; Keisuke Maehata; Kazuhisa Mitsuda; Noriko Y. Yamasaki; Mitsuaki Ohsaki; Katsuaki Watanabe; Xiuzhen Yu; Takuji Ito; Yoshihiro Yamanaka

2010-02-01T23:59:59.000Z

63

Probing the electronic structure and optical response of a graphene quantum disk supported on monolayer graphene  

SciTech Connect (OSTI)

In this paper, we show that a graphene quantum disk (GQD) can be generated on monolayer graphene via structural modification using the electron beam. The electronic structure and local optical responses of the GQD, supported on monolayer graphene, were probed with electron energy-loss spectrum imaging on an aberration-corrected scanning transmission electron microscope. We observe that for small GQD, {approx}1.3 nm in diameter, the electronic structure and optical response are governed by the dominating edge states, and are distinctly different from either monolayer graphene or double-layer graphene. Highly localized plasmon modes are generated at the GQD due to the confinement from the edge of the GQD in all directions. The highly localized optical response from GQDs could find use in designing nanoscale optoelectronic and plasmonic devices based on monolayer graphene.

Zhou, Wu [Vanderbilt University; Pennycook, Stephen J [ORNL; Idrobo Tapia, Juan C [ORNL

2012-01-01T23:59:59.000Z

64

Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy  

SciTech Connect (OSTI)

Observation of growth, synthesis, dynamics and electrochemical reactions in the liquid state is an important yet largely unstudied aspect of nanotechnology. The only techniques that can potentially provide the insights necessary to advance our understanding of these mechanisms is simultaneous atomic-scale imaging and quantitative chemical analysis (through spectroscopy) under environmental conditions in the transmission electron microscope (TEM). In this study we describe the experimental and technical conditions necessary to obtain electron energy loss (EEL) spectra from a nanoparticle in colloidal suspension using aberration corrected scanning transmission electron microscopy (STEM) combined with the environmental liquid stage. At a fluid path length below 400 nm, atomic resolution images can be obtained and simultaneous compositional analysis can be achieved. We show that EEL spectroscopy can be used to quantify the total fluid path length around the nanoparticle, and demonstrate characteristic core-loss signals from the suspended nanoparticles can be resolved and analyzed to provide information on the local interfacial chemistry with the surrounding environment. The combined approach using aberration corrected STEM and EEL spectra with the in situ fluid stage demonstrates a plenary platform for detailed investigations of solution based catalysis and biological research.

Jungjohann, K. L.; Evans, James E.; Aguiar, Jeff; Arslan, Ilke; Browning, Nigel D.

2012-06-04T23:59:59.000Z

65

Atomic Structure and Composition of "Pt3Co" Nanocatalysts in Fuel Cells: An Aberration-Corrected STEM HAADF Study  

E-Print Network [OSTI]

and split into protons and electrons by catalyst nanoparticles (NPs). At the cathode side, air is delivered In addition, catalyst NPs are typically composed of platinum (Pt), which imposes large costs on PEMFC of the oxygen reduction reaction (ORR) in the cathode of PEMFCs. Two strategies are shown to increase

Ferreira, Paulo J.

66

A new approach to nuclear microscopy: The ion-electron emission microscope  

SciTech Connect (OSTI)

A new multidimensional high lateral resolution ion beam analysis technique, Ion-Electron Emission Microscopy or IEEM is described. Using MeV energy ions, IEEM is shown to be capable of Ion Beam Induced Charge Collection (IBICC) measurements in semiconductors. IEEM should also be capable of microscopically and multidimensionally mapping the surface and bulk composition of solids. As such, IIEM has nearly identical capabilities as traditional nuclear microprobe analysis, with the advantage that the ion beam does not have to be focused. The technique is based on determining the position where an individual ion enters the surface of the sample by projection secondary electron emission microscopy. The x-y origination point of a secondary electron, and hence the impact coordinates of the corresponding incident ion, is recorded with a position sensitive detector connected to a standard photoemission electron microscope (PEEM). These signals are then used to establish coincidence with IBICC, atomic, or nuclear reaction induced ion beam analysis signals simultaneously caused by the incident ion.

Doyle, B.L.; Vizkelethy, G.; Walsh, D.S. [Sandia National Labs., Albuquerque, NM (United States); Senftinger, B. [Staib Instrumente GmbH, Langenbach (Germany); Mellon, M. [Quantar Technologies Inc., Santa Cruz, CA (United States)

1998-11-01T23:59:59.000Z

67

Phase and birefringence aberration correction  

DOE Patents [OSTI]

A Brillouin enhanced four wave mixing phase conjugate mirror corrects phase aberrations of a coherent electromagnetic beam and birefringence induced upon that beam. The stimulated Brillouin scattering (SBS) phase conjugation technique is augmented to include Brillouin enhanced four wave mixing (BEFWM). A seed beam is generated by a main oscillator which arrives at the phase conjugate cell before the signal beams in order to initiate the Brillouin effect. The signal beam which is being amplified through the amplifier chain is split into two perpendicularly polarized beams. One of the two beams is chosen to be the same polarization as some component of the seed beam, the other orthogonal to the first. The polarization of the orthogonal beam is then rotated 90.degree. such that it is parallel to the other signal beam. The three beams are then focused into cell containing a medium capable of Brillouin excitation. The two signal beams are focused such that they cross the seed beam path before their respective beam waists in order to achieve BEFWM or the two signal beams are focused to a point or points contained within the focused cone angle of the seed beam to achieve seeded SBS, and thus negate the effects of all birefringent and material aberrations in the system.

Bowers, Mark (Modesto, CA); Hankla, Allen (Livermore, CA)

1996-01-01T23:59:59.000Z

68

Direct Imaging of Quantum Antidots in MgO Dispersed with Au Nanocluste...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

imaging in aberration corrected scanning transmission electron microscope, that vacancies in excess of Au atoms are clustering together to form antidots at the immediate...

69

Model-independent quantitative measurement of nanomechanical oscillator vibrations using electron-microscope linescans  

SciTech Connect (OSTI)

Nanoscale mechanical resonators are highly sensitive devices and, therefore, for application as highly sensitive mass balances, they are potentially superior to micromachined cantilevers. The absolute measurement of nanoscale displacements of such resonators remains a challenge, however, since the optical signal reflected from a cantilever whose dimensions are sub-wavelength is at best very weak. We describe a technique for quantitative analysis and fitting of scanning-electron microscope (SEM) linescans across a cantilever resonator, involving deconvolution from the vibrating resonator profile using the stationary resonator profile. This enables determination of the absolute amplitude of nanomechanical cantilever oscillations even when the oscillation amplitude is much smaller than the cantilever width. This technique is independent of any model of secondary-electron emission from the resonator and is, therefore, applicable to resonators with arbitrary geometry and material inhomogeneity. We demonstrate the technique using focussed-ion-beam–deposited tungsten cantilevers of radius ?60–170 nm inside a field-emission SEM, with excitation of the cantilever by a piezoelectric actuator allowing measurement of the full frequency response. Oscillation amplitudes approaching the size of the primary electron-beam can be resolved. We further show that the optimum electron-beam scan speed is determined by a compromise between deflection of the cantilever at low scan speeds and limited spatial resolution at high scan speeds. Our technique will be an important tool for use in precise characterization of nanomechanical resonator devices.

Wang, Huan; Fenton, J. C.; Chiatti, O. [London Centre for Nanotechnology, University College London, 17–19 Gordon Street, London WC1H 0AH (United Kingdom)] [London Centre for Nanotechnology, University College London, 17–19 Gordon Street, London WC1H 0AH (United Kingdom); Warburton, P. A. [London Centre for Nanotechnology, University College London, 17–19 Gordon Street, London WC1H 0AH (United Kingdom) [London Centre for Nanotechnology, University College London, 17–19 Gordon Street, London WC1H 0AH (United Kingdom); Department of Electronic and Electrical Engineering, University College London, Torrington Place, London WC1E 7JE (United Kingdom)

2013-07-15T23:59:59.000Z

70

2013 R&D 100 Award: Movie-mode electron microscope captures nanoscale  

ScienceCinema (OSTI)

A new instrument developed by LLNL scientists and engineers, the Movie Mode Dynamic Transmission Electron Microscope (MM-DTEM), captures billionth-of-a-meter-scale images with frame rates more than 100,000 times faster than those of conventional techniques. The work was done in collaboration with a Pleasanton-based company, Integrated Dynamic Electron Solutions (IDES) Inc. Using this revolutionary imaging technique, a range of fundamental and technologically important material and biological processes can be captured in action, in complete billionth-of-a-meter detail, for the first time. The primary application of MM-DTEM is the direct observation of fast processes, including microstructural changes, phase transformations and chemical reactions, that shape real-world performance of nanostructured materials and potentially biological entities. The instrument could prove especially valuable in the direct observation of macromolecular interactions, such as protein-protein binding and host-pathogen interactions. While an earlier version of the technology, Single Shot-DTEM, could capture a single snapshot of a rapid process, MM-DTEM captures a multiframe movie that reveals complex sequences of events in detail. It is the only existing technology that can capture multiple electron microscopy images in the span of a single microsecond.

Lagrange, Thomas; Reed, Bryan

2014-07-21T23:59:59.000Z

71

2013 R&D 100 Award: Movie-mode electron microscope captures nanoscale  

SciTech Connect (OSTI)

A new instrument developed by LLNL scientists and engineers, the Movie Mode Dynamic Transmission Electron Microscope (MM-DTEM), captures billionth-of-a-meter-scale images with frame rates more than 100,000 times faster than those of conventional techniques. The work was done in collaboration with a Pleasanton-based company, Integrated Dynamic Electron Solutions (IDES) Inc. Using this revolutionary imaging technique, a range of fundamental and technologically important material and biological processes can be captured in action, in complete billionth-of-a-meter detail, for the first time. The primary application of MM-DTEM is the direct observation of fast processes, including microstructural changes, phase transformations and chemical reactions, that shape real-world performance of nanostructured materials and potentially biological entities. The instrument could prove especially valuable in the direct observation of macromolecular interactions, such as protein-protein binding and host-pathogen interactions. While an earlier version of the technology, Single Shot-DTEM, could capture a single snapshot of a rapid process, MM-DTEM captures a multiframe movie that reveals complex sequences of events in detail. It is the only existing technology that can capture multiple electron microscopy images in the span of a single microsecond.

Lagrange, Thomas; Reed, Bryan

2014-04-03T23:59:59.000Z

72

Quantifying Transient States in Materials with the Dynamic Transmission Electron Microscope  

SciTech Connect (OSTI)

The Dynamic Transmission Electron Microscope (DTEM) offers a means of capturing rapid evolution in a specimen through in-situ microscopy experiments by allowing 15 ns electron micrograph exposure times. The rapid exposure time is enabled by creating a burst of electrons at the emitter by ultraviolet pulsed laser illumination. This burst arrives a specified time after a second laser initiates the specimen reaction. The timing of the two Q-switched lasers is controlled by high-speed pulse generators with a timing error much less than the pulse duration. Both diffraction and imaging experiments can be performed, just as in a conventional TEM. The brightness of the emitter and the total current control the spatial and temporal resolutions. We have demonstrated 7 nm spatial resolution in single 15 ns pulsed images. These single-pulse imaging experiments have been used to study martensitic transformations, nucleation and crystallization of an amorphous metal, and rapid chemical reactions. Measurements have been performed on these systems that are possible by no other experimental approaches currently available.

Campbell, G; LaGrange, T; Kim, J; Reed, B; Browning, N

2009-09-21T23:59:59.000Z

73

Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope  

SciTech Connect (OSTI)

The surface conductivity measurement system using a micro-four-point probe (M4PP) had been developed for the ultrahigh vacuum transmission electron microscope (UHV-TEM). Since the current distribution in the sample crystals during the current voltage measurement by the M4PP is localized within the depth of several micrometers from the surface, the system is sensitive to the surface conductivity, which is related with the surface superstructure. It was installed in the main chamber of the TEM and the surface conductivity can be measured in situ. The surface structures were observed by reflection electron microscopy and diffraction (REM-RHEED). REM-RHEED enables us to observe the surface superstructures and their structure defects such as surface atomic steps and domain boundaries of the surface superstructure. Thus the effects of the defects on the surface conductivity can be investigated. In the present paper we present the surface conductivity measurement system and its application to the Si(111)-{radical}(3)x{radical}(3)-Ag surface prepared on the Si(111) vicinal surfaces. The result clearly showed that the surface conductivity was affected by step configuration.

Minoda, H. [Department of Applied Physics, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184-8588 (Japan); CREST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012 (Japan); Hatano, K.; Yazawa, H. [Department of Applied Physics, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184-8588 (Japan)

2009-11-15T23:59:59.000Z

74

Electron microscopic investigations and indexing studies of psorosis and citrus ringspot virus of citrus / by Margaret Atchison Barkley  

E-Print Network [OSTI]

on 2%%u uranyl acetate for 5 minutes and on lead citrate for 1 minute. Two to three grids were made from each cap- sule. A11 sections were examined with a Hitachi HS-7S electron microscope. 14 CHAPTER IV RESULTS AND DISCUSSION During the spring...

Barkley, Margaret Atchison

1979-01-01T23:59:59.000Z

75

Scanning electron microscopic study of laser-induced morphologic changes of a coated enamel surface  

SciTech Connect (OSTI)

A low-energy Nd:YAG laser was used to irradiate extracted human teeth coated with a black energy-absorbent laser initiator in a study to determine the extent of the morphologic changes produced in the enamel surface. The laser initiator was applied to a cleaned enamel surface and irradiated at an energy output of 30 mJ or 75 mJ. Both energy levels produced morphologic changes of the surface. There was a sharp line of demarcation between the coated, irradiated area and the surrounding noncoated enamel surface. The scanning electron microscope view at the lower energy level showed that the surface had melted and reformed with numerous small, bubble-like inclusions. The 75 mJ energy level showed individual impact craters with shallow centers and raised edges containing numerous pores and large, bubble-like inclusions. Etching is a dental procedure in which an acid is normally used to remove a thin outer layer of the tooth structure. This is necessary to create a roughened, irregular surface in order to provide mechanical retention for dental restorative materials. The changes produced by the laser in this study suggest a simple, effective, and controlled method of etching the enamel surface of a tooth by altering its surface characteristics.

Hess, J.A. (Univ. of Detroit School of Dentistry, MI (USA))

1990-01-01T23:59:59.000Z

76

High precision two-dimensional strain mapping in semiconductor devices using nanobeam electron diffraction in the transmission electron microscope  

SciTech Connect (OSTI)

A classical method used to characterize the strain in modern semiconductor devices is nanobeam diffraction (NBD) in the transmission electron microscope. One challenge for this method lies in the fact that the smaller the beam becomes, the more difficult it becomes to analyze the resulting diffraction spot pattern. We show that a carefully designed fitting algorithm enables us to reduce the sampling area for the diffraction patterns on the camera chip dramatically (?1/16) compared to traditional settings without significant loss of precision. The resulting lower magnification of the spot pattern permits the presence of an annular dark field detector, which in turn makes the recording of images for drift correction during NBD acquisition possible. Thus, the reduced sampling size allows acquisition of drift corrected NBD 2D strain maps of up to 3000 pixels while maintaining a precision of better than 0.07%. As an example, we show NBD strain maps of a modern field effect transistor (FET) device. A special filtering feature used in the analysis makes it is possible to measure strain in silicon devices even in the presence of other crystalline materials covering the probed area, which is important for the characterization of the next generation of devices (Fin-FETs).

Baumann, Frieder H., E-mail: fhbauman@us.ibm.com [IBM Microelectronics Division, 2070 Route 52, Hopewell Junction, New York 12533 (United States)

2014-06-30T23:59:59.000Z

77

Quantifying transient states in materials with the dynamic transmission electron microscope  

Science Journals Connector (OSTI)

......Engineering and Materials Science and Department...interest to the materials scientist. It has...Computer-controlled, active-feedback pointing...at the microscope cathode. The cathode is...specimen and the cathode laser fires at a...comparison to models of materials evolution. Image......

Geoffrey H. Campbell; Thomas LaGrange; Judy S. Kim; Bryan W. Reed; Nigel D. Browning

2010-08-01T23:59:59.000Z

78

A Novel Method for Passive Digital Image Acquisition from a Scanning Electron Microscope  

E-Print Network [OSTI]

.............................................................................................................. 7 4.1 Frame Grabbing .................................................................................................. 8 4.2 Analog to Digital Converter Sampling ............................................................... 9 4.3 Digitally... generated in one of two methods. An inefficient method for electron beam generation is thermionic emission. In thermionic emission, electrons are emitted by passing electronic current through a heating element, which is usually made from tungsten. A...

Makarewicz, Joseph Sylvester

2009-01-01T23:59:59.000Z

79

Transmission-mode imaging in the environmental scanning electron microscope (ESEM)  

E-Print Network [OSTI]

sources function by heating a material until it starts to emit electrons (by increasing the energy of free electrons to above the Fermi surface of the material) and field-emission sources function by applying an electric field strong enough that electrons... obtained from studying E. coli, C. necator, and S. Typhimurium (Chapter 8) have been accepted for publication in Scanning, titled “The application of STEM and in-situ controlled dehydration to bac- terial systems using ESEM”. i Acknowledgements This project...

Staniewicz, Lech Thomas Leif

2012-02-07T23:59:59.000Z

80

New carbon cone nanotip for use in a highly coherent cold field emission electron microscope  

E-Print Network [OSTI]

1 New carbon cone nanotip for use in a highly coherent cold field emission electron Jeanne Marvig, BP 94347, TOULOUSE, Cedex 4, FRANCE Abstract A new cathode for cold-field emission gun using a pyrolytic carbon-cone supported onto a carbon nanotube as the electron emitting tip has been

Paris-Sud XI, Université de

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
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81

Electron microscope studies. Progress report, June 1, 1992--November 1, 1993  

SciTech Connect (OSTI)

During the past year we have continued our work on the mirror-corrected high resolution STEM. We have made significant progress in the design and fabrication of the various microscope sub-systems and have completed a new display system. Additional calculations and computer simulations have been performed to confirm the original theory of mirror correctors. In our biological work we have made a careful study of the structure of globins, vertebrate and invertebrate, using the accumulated information contained in the Brookhaven Data Bank (3D structures), the Protein Identification Resource (ID sequences) and the data we have obtained with the STEM. Statistical templates have been generated to predict various classes of globins.

Crewe, A.V.; Kapp, O.H.

1993-11-01T23:59:59.000Z

82

Detailed microscopic calculation of stellar electron and positron capture rates on $^{24}$Mg for O+Ne+Mg core simulations  

E-Print Network [OSTI]

Few white dwarfs, located in binary systems, may acquire sufficiently high mass accretion rates resulting in the burning of carbon and oxygen under nondegenerate conditions forming a O+Ne+Mg core. These O+Ne+Mg cores are gravitationally less bound than more massive progenitor stars and can release more energy due to the nuclear burning. They are also amongst the probable candidates for low entropy r-process sites. Recent observations of subluminous Type II-P supernovae (e.g., 2005cs, 2003gd, 1999br, 1997D) were able to rekindle the interest in 8 -- 10 M$_{\\odot}$ which develop O+Ne+Mg cores. Microscopic calculations of capture rates on $^{24}$Mg, which may contribute significantly to the collapse of O+Ne+Mg cores, using shell model and proton-neutron quasiparticle random phase approximation (pn-QRPA) theory, were performed earlier and comparisons made. Simulators, however, may require these capture rates on a fine scale. For the first time a detailed microscopic calculation of the electron and positron captur...

Nabi, Jameel-Un

2014-01-01T23:59:59.000Z

83

Scanning photoelectron microscope for nanoscale three-dimensional spatial-resolved electron spectroscopy for chemical analysis  

E-Print Network [OSTI]

spectroscopy for chemical analysis K. Horiba, Y. Nakamura, N. Nagamura, S. Toyoda, H. Kumigashira et al-level alignment at noble metal/organic interfaces Appl. Phys. Lett. 99, 183302 (2011) Note: Heated sample platform three-dimensional spatial-resolved electron spectroscopy for chemical analysis K. Horiba,1,2,3,a) Y

Miyashita, Yasushi

84

Electron microscopic evidence for a tribologically induced phase transformation as the origin of wear in diamond  

SciTech Connect (OSTI)

Tribological testing of a coarse-grained diamond layer, deposited by plasma-enhanced chemical vapor deposition, was performed on a ring-on-ring tribometer with a diamond counterpart. The origin of the wear of diamond and of the low friction coefficient of 0.15 was studied by analyzing the microstructure of worn and unworn regions by transmission and scanning electron microscopy. In the worn regions, the formation of an amorphous carbon layer with a thickness below 100?nm is observed. Electron energy loss spectroscopy of the C-K ionization edge reveals the transition from sp{sup 3}-hybridized C-atoms in crystalline diamond to a high fraction of sp{sup 2}-hybridized C-atoms in the tribo-induced amorphous C-layer within a transition region of less than 5?nm thickness. The mechanically induced phase transformation from diamond to the amorphous phase is found to be highly anisotropic which is clearly seen at a grain boundary, where the thickness of the amorphous layer above the two differently oriented grains abruptly changes.

Zhang, Xinyi; Schneider, Reinhard; Müller, Erich; Gerthsen, Dagmar [Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Engesserstr. 7, D-76131 Karlsruhe (Germany); Mee, Manuel; Meier, Sven [Fraunhofer Institute for Mechanics of Materials IWM, Wöhlerstr. 11, D-79108 Freiburg (Germany); Gumbsch, Peter [Fraunhofer Institute for Mechanics of Materials IWM, Wöhlerstr. 11, D-79108 Freiburg (Germany); Institute for Applied Materials IAM, Karlsruhe Institute of Technology (KIT), Kaiserstr. 12, D-76131 Karlsruhe (Germany)

2014-02-14T23:59:59.000Z

85

Detailed microscopic calculation of stellar electron and positron capture rates on $^{24}$Mg for O+Ne+Mg core simulations  

E-Print Network [OSTI]

Few white dwarfs, located in binary systems, may acquire sufficiently high mass accretion rates resulting in the burning of carbon and oxygen under nondegenerate conditions forming a O+Ne+Mg core. These O+Ne+Mg cores are gravitationally less bound than more massive progenitor stars and can release more energy due to the nuclear burning. They are also amongst the probable candidates for low entropy r-process sites. Recent observations of subluminous Type II-P supernovae (e.g., 2005cs, 2003gd, 1999br, 1997D) were able to rekindle the interest in 8 -- 10 M$_{\\odot}$ which develop O+Ne+Mg cores. Microscopic calculations of capture rates on $^{24}$Mg, which may contribute significantly to the collapse of O+Ne+Mg cores, using shell model and proton-neutron quasiparticle random phase approximation (pn-QRPA) theory, were performed earlier and comparisons made. Simulators, however, may require these capture rates on a fine scale. For the first time a detailed microscopic calculation of the electron and positron capture rates on $^{24}$Mg on an extensive temperature-density scale is presented here. This type of scale is more appropriate for interpolation purposes and of greater utility for simulation codes. The calculations are done using the pn-QRPA theory using a separable interaction. The deformation parameter, believed to be a key parameter in QRPA calculations, is adopted from experimental data to further increase the reliability of the QRPA results. The resulting calculated rates are up to a factor of 14 or more enhanced as compared to shell model rates and may lead to some interesting scenario for core collapse simulators.

Jameel-Un Nabi

2014-08-15T23:59:59.000Z

86

Correlation between resistance-change effect in transition-metal oxides and secondary-electron contrast of scanning electron microscope images  

SciTech Connect (OSTI)

Conductive atomic-force microscopy (C-AFM) writing is attracting attention as a technique for clarifying the switching mechanism of resistive random-access memory by providing a wide area filled with filaments, which can be regarded as one filament with large radius. The writing area on a nickel-oxide (NiO) film formed by conductive atomic-force microscopy was observed by scanning electron microscope, and a correlation between the contrast in a secondary-electron image (SEI) and the resistance written by C-AFM was revealed. In addition, the dependence of the SEI contrast on the beam accelerating voltage (V{sub accel}) suggests that the resistance-change effect occurs near the surface of the NiO film. As for the effects of electron irradiation and vacuum annealing on the C-AFM writing area, it was shown that the resistance-change effect is caused by exchange of oxygen with the atmosphere at the surface of the NiO film. This result suggests that the low-resistance and high-resistance areas are, respectively, p-type Ni{sub 1+{delta}}O ({delta} < 0) and insulating (stoichiometric) or n-type Ni{sub 1+{delta}}O ({delta}{>=} 0).

Kinoshita, K.; Kishida, S. [Department of Information and Electronics, Graduate School of Engineering, Tottori University, 4-101 Koyama-Minami, Tottori 680-8552 (Japan); Tottori University Electronic Display Research Center, 522-2 Koyama-Kita, Tottori 680-0941 (Japan); Yoda, T. [Department of Information and Electronics, Graduate School of Engineering, Tottori University, 4-101 Koyama-Minami, Tottori 680-8552 (Japan)

2011-09-15T23:59:59.000Z

87

Real-time studies of battery electrochemical reactions inside a transmission electron microscope.  

SciTech Connect (OSTI)

We report the development of new experimental capabilities and ab initio modeling for real-time studies of Li-ion battery electrochemical reactions. We developed three capabilities for in-situ transmission electron microscopy (TEM) studies: a capability that uses a nanomanipulator inside the TEM to assemble electrochemical cells with ionic liquid or solid state electrolytes, a capability that uses on-chip assembly of battery components on to TEM-compatible multi-electrode arrays, and a capability that uses a TEM-compatible sealed electrochemical cell that we developed for performing in-situ TEM using volatile battery electrolytes. These capabilities were used to understand lithiation mechanisms in nanoscale battery materials, including SnO{sub 2}, Si, Ge, Al, ZnO, and MnO{sub 2}. The modeling approaches used ab initio molecular dynamics to understand early stages of ethylene carbonate reduction on lithiated-graphite and lithium surfaces and constrained density functional theory to understand ethylene carbonate reduction on passivated electrode surfaces.

Leung, Kevin; Hudak, Nicholas S.; Liu, Yang; Liu, Xiaohua H.; Fan, Hongyou; Subramanian, Arunkumar; Shaw, Michael J.; Sullivan, John Patrick; Huang, Jian Yu

2012-01-01T23:59:59.000Z

88

Crystal structure of Si3N4·Y2O3 examined by a 1 MV high-resolution electron microscope  

Science Journals Connector (OSTI)

The crystal structure of Si3N4·Y2O3...prepared by a hot-press is examined in a 1 MV high-resolution electron microscope. The image contrast reveals that it is isostructural with one of the layered silicates, Akermanite

S. Horiuchi; M. Mitomo

1979-11-01T23:59:59.000Z

89

Electron microscope studies. Progress report, 1 July 1990--1 June 1991  

SciTech Connect (OSTI)

This year our laboratory has continued to make progress in the design of electron-optical systems, in the study of structure-function relationships of large multi-subunit proteins, in the development of new image processing software and in achieving a workable sub-angstrom STEM. We present an algebraic approach to the symmetrical Einzel (unipotential) lens wherein we simplify the analysis by specifying a field shape that meets some preferred set of boundary or other conditions and then calculate the fields. In a second study we generalize this approach to study of three element electrostatic lenses of which the symmetrical Einzel lens is a particular form. The purpose is to develop a method for assisting in the design of a lens for a particular purpose. In our biological work we study a stable and functional dodecameric complex of globin chains from the hemoglobin of Lumbricus terrestris. This is a complex lacking the ``linker`` subunit first imaged in this lab and required for maintenance of the native structure. In addition, we do a complete work-up on the hemoglobin of the marine polychaete Eudistylia vancouverii demonstrating the presence of a hierarchy of globin complexes. We demonstrate stable field-emission in the sub-angstrom STEM and the preliminary alignment of the beam. We continue our exploration of a algorithms for alignment of sequences of protein and DNA. Our computer facilities now include four second generation RISC workstations and we continue to take increasing advantage of the floating-point and graphical performance of these devices.

Crewe, A.V.; Kapp, O.H.

1991-06-01T23:59:59.000Z

90

A scanning electron microscope study on agglomeration in petroleum coke-fired FBC boilers  

Science Journals Connector (OSTI)

Ten samples originating from different boiler FBC systems burning petroleum coke and one laboratory sample were chosen to perform a study on the development, structure, and composition of deposits formed by agglomeration in various locations. The work focused on examination by scanning electron microscopy (SEM) and energy dispersive X-ray (EDX) analysis. The possibility of a contribution of liquid phases in the adherence to solid surfaces and in agglomeration was discussed and checks by SEM, EDX, and analysis by neutron activation were performed; no evidence could be found either for liquid phases or for any role of vanadium or alkaline element compounds. The agglomerations result from the continued sintering of CaSO4 particles until they build up a strong framework that is indefinitely extended, into which particles of different and complex compositions are bound, without contributing to the cohesion. Chemical sintering occurring by the sulphation of CaO into CaSO4 appears to be an important contribution while CaO is still available, but sintering also occurs by mass transfer mechanisms and continues after the depletion of CaO. Deposits formed in regions only reached by fly ash (convection section), and also in in-bed deposits, grow from particles <50 ?m, mostly in the range of 10 ?m or less. In regions collecting bed ash (e.g., J-valves), the deposit grows from the sintering together of particles on the order of 100–300 ?m (originally bed ash particles), which themselves appear as conglomerates of extensively sintered smaller particles.

J.V Iribarne; E.J Anthony; A Iribarne

2003-01-01T23:59:59.000Z

91

Improvement of windowed type environmental-cell transmission electron microscope for in situ observation of gas-solid interactions  

SciTech Connect (OSTI)

We have developed an improved, windowed type environmental-cell (E-cell) transmission electron microscope (TEM) for in situ observation of gas-solid interactions, such as catalytic reactions at atmospheric pressure. Our E-cell TEM includes a compact E-cell specimen holder with mechanical stability, resulting in smoother introduction of the desired gases compared with previous E-cell TEMs. In addition, the gas control unit was simplified by omitting the pressure control function of the TEM pre-evacuation chamber. This simplification was due to the successful development of remarkably tough thin carbon films as the window material. These films, with a thickness of <10 nm, were found to withstand pressure differences >2 atm. Appropriate arrangement of the specimen position inside the E-cell provided quantitatively analyzable TEM images, with no disturbances caused by the windowed films. As an application, we used this E-cell TEM to observe the dynamic shape change in a catalytic gold nanoparticle supported on TiO{sub 2} during the oxidation of CO gas.

Kawasaki, Tadahiro [Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603 (Japan); PRESTO-JST, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012 (Japan); Ueda, Kouta [Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa, Nagoya 464-8603 (Japan); Ichihashi, Mikio; Tanji, Takayoshi [EcoTopia Science Institute, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603 (Japan)

2009-11-15T23:59:59.000Z

92

Reading Comprehension - Microscopes  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Microscopes Microscopes It happened over 300 years _________ since ago before after in Holland. Anton van Leeuwenhoek (AN-tun van LAY-vun-hook) had a new microscope that he had _________ made lost previewed delivered . One day he _________ fell broke looked went through it at a drop of lake water. What he saw surprised him. The water was alive with what Leeuwenhoek called "wee beasties." The microscope made tiny organisms look 200 times _________ farther smaller darker larger than life size. Leeuwenhoek was one of the first scientists to see living things that were that _________ life small darker larger . His work was a giant _________ turtle gorilla step tower for science. Today, microscopes are much stronger. An electron microscope can make tiny organisms look 200,000 times _________ small over under life size. A few

93

Fish scale deformation analysis using scanning electron microscope: New potential biomarker in aquatic environmental monitoring of aluminum and iron contamination  

SciTech Connect (OSTI)

Fish scale has the potential to be a rapid biomarker due to its structure and high possibility to come into contact with any pollutant in the aquatic environment. The scale structure consists of osteoblastic cells and other bone materials such as collagen where it is possible to form a molecular complex with heavy metals such as aluminum and iron. Hence, aluminum and iron in water could possibly destroy the scale material and marked as a scale deformation that quantitatively could be analyzed by comparing it to the normal scale structure. Water sampling and fish cage experiment were performed between June and July 2011 in Porong river which represented the water body that has high aluminum and iron contamination. The filtered water samples were preserved and extracted using the acid-mixture procedure prior to measurement of the aluminum and iron concentrations using Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES), while samples for total suspended solid (TSS) analysis were kept at 4 °C in cool-boxes. The scales were cleaned with sterile water, then dehydrated in 30, 50, 70, and 90% ethanol and dried on filter papers. They were then mounted on an aluminum stub and coated with gold in a sputter coater prior to Scanning Electron Microscope (SEM) observation. According to the SEM analysis, it was found that there were several deformations on the scale samples taken from sites that have high concentrations of aluminum and iron i.e. the increasing number of pits, deformation and decreasing number of spherules and ridges while the control scale exhibited the normal features. However, the site with higher TSS and pH indicated lower aluminum effect. A moderate correlation was found between the number of pits with aluminum (r=0.43) and iron (r=0.41) concentrations. Fish scale deformation using SEM analysis can potentially be a rapid biomarker in aquatic monitoring of aluminum and iron contamination. However, the measurement must be accompanied by pH and TSS observations.

Hidayati, Dewi; Sulaiman, Norela; Othman, Shuhaimi; Ismail, B. S. [School of Environmental and Natural Resource Sciences, Faculty of Science and Technology, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor (Malaysia)

2013-11-27T23:59:59.000Z

94

Advanced electron microscopic techniques applied to the characterization of irradiation effects and fission product identification of irradiated TRISO coated particles from the AGR-1 experiment  

SciTech Connect (OSTI)

Preliminary electron microscopy of coated fuel particles from the AGR-1 experiment was conducted using characterization techniques such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy dispersive spectroscopy (EDS), and wavelength dispersive spectroscopy (WDS). Microscopic quantification of fission-product precipitates was performed. Although numerous micro- and nano-sized precipitates observed in the coating layers during initial SEM characterization of the cross-sections, and in subsequent TEM diffraction patterns, were indexed as UPd{sub 2}Si{sub 2}, no Ag was conclusively found. Additionally, characterization of these precipitates highlighted the difficulty of measuring low concentrations of Ag in precipitates in the presence of significantly higher concentrations of Pd and U. The electron microscopy team followed a multi-directional and phased approach in the identification of fission products in irradiated TRISO fuel. The advanced electron microscopy techniques discussed in this paper, not only demonstrate the usefulness of the equipment (methods) as relevant research tools, but also provide relevant scientific results which increase the knowledge about TRISO fuel particles microstructure and fission products transport.

Rooyen, I.J. van; Lillo, T.M.; Trowbridge, T.L.; Madden, J.M. [Idaho National Laboratory, Idaho Falls, ID 83415-6188 (United States); Wu, Y.Q. [Boise State University, Boise, ID 83725-2090 (United States); Center for Advanced Energy Studies, Idaho Falls, ID 83401 (United States); Goran, D. [Brucker Nano Gmbh, Berlin, 12489 (Germany)

2013-07-01T23:59:59.000Z

95

Room temperature electron transport properties of single C{sub 60} studied using scanning tunneling microscope and reak junctions.  

SciTech Connect (OSTI)

We report the measurements of the electron transport of an individual C{sub 60} molecule through the combination of two experimental efforts. The nanometer-sized junctions were fabricated using electromigration combined with electron beam lithography and shadow effect evaporation. We performed the scanning tunneling microscopy/spectroscopy measurements of dispersed C{sub 60} molecules which were deposited on a highly ordered pyrolytic graphite substrate. The single electron tunneling through a single C{sub 60} molecule due to the Coulomb blockage effect is observed at room temperature.

Cheng, R.; Carvell, J.; Fradin, F. Y.; Indiana Univ.-Purdue Univ. at Indianapolis

2010-09-15T23:59:59.000Z

96

Particle analysis for a strengthened safeguards system: Use of a scanning electron microscope equipped with EDXRF and WDXRF spectrometers  

Science Journals Connector (OSTI)

The purpose of this study was twofold: the identification of some uranium compounds and a measurement of mixed U/Pu particles with different ratios of these elements. We used a Philips XL-30 scanning electron ...

A. Ciurapinski; J. Parus; D. Donohue

2002-03-01T23:59:59.000Z

97

Neutron Microscope  

Science Journals Connector (OSTI)

We report successful operation of a neutron microscope using ultracold neutrons at the high-flux reactor at Grenoble. A sharp, achromatic image of an object slit was obtained at a magnification of 50. The measured resolution of 0.1 mm was limited mainly by the available beam intensity, not by aberrations.

P. Herrmann; K. -A. Steinhauser; R. Gähler; A. Steyerl; W. Mampe

1985-05-06T23:59:59.000Z

98

In situ redox cycle of a nickelYSZ fuel cell anode in an environmental transmission electron microscope  

E-Print Network [OSTI]

of a nickel/yttria-stabilized zirconia solid oxide fuel cell anode. The results reveal that the transfer transmission electron microscopy (ETEM); Solid oxide fuel cell (SOFC); Reduction; Oxidation; Density functional theory (DFT) 1. Introduction Solid oxide fuel cell (SOFC) technology is a promising energy conversion

Dunin-Borkowski, Rafal E.

99

Ultrafast supercontinuum fiber-laser based pump-probe scanning magneto-optical Kerr effect microscope for the investigation of electron spin dynamics in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution  

SciTech Connect (OSTI)

We describe a two-color pump-probe scanning magneto-optical Kerr effect microscope which we have developed to investigate electron spin phenomena in semiconductors at cryogenic temperatures with picosecond time and micrometer spatial resolution. The key innovation of our microscope is the usage of an ultrafast “white light” supercontinuum fiber-laser source which provides access to the whole visible and near-infrared spectral range. Our Kerr microscope allows for the independent selection of the excitation and detection energy while avoiding the necessity to synchronize the pulse trains of two separate picosecond laser systems. The ability to independently tune the pump and probe wavelength enables the investigation of the influence of excitation energy on the optically induced electron spin dynamics in semiconductors. We demonstrate picosecond real-space imaging of the diffusive expansion of optically excited electron spin packets in a (110) GaAs quantum well sample to illustrate the capabilities of the instrument.

Henn, T.; Kiessling, T., E-mail: tobias.kiessling@physik.uni-wuerzburg.de; Ossau, W.; Molenkamp, L. W. [Physikalisches Institut (EP3), Universität Würzburg, 97074 Würzburg (Germany)] [Physikalisches Institut (EP3), Universität Würzburg, 97074 Würzburg (Germany); Biermann, K.; Santos, P. V. [Paul-Drude-Institut für Festkörperelektronik, 10117 Berlin (Germany)] [Paul-Drude-Institut für Festkörperelektronik, 10117 Berlin (Germany)

2013-12-15T23:59:59.000Z

100

Total energy study of the microscopic structure and electronic properties of tetragonal perovskite SrTiO{sub 3}  

SciTech Connect (OSTI)

To study the structural and electronic properties of cubic perovskite SrTiO{sub 3} and its stress-induced tetragonal phase, we have performed total energy calculations and studied the effect of oxygen vacancies on the electronic properties of tetragonal perovskite SrTiO{sub 3}. The method used was the relativistic full-potential linearized augmented plane wave (FLAPW) method. To obtain the geometry that minimizes the total energy, we relaxed the internal atomic sites of the tetragonal cell. As a result of this procedure, we have found that the titanium atoms move toward the plane of the vacancy by 0.03 Å, and the apical oxygen atoms move to the same plane by approximately 0.14 Å. These results are discussed in comparison with experimental data.

Rubio-Ponce, A. [Departamento de Ciencias Básicas, Universidad Autónoma Metropolitana-Azcapotzalco, Av. San Pablo 180, 02200 México, D.F. (Mexico); Olguín, D. [Departamento de Física, Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, A.P. 14740, México, D.F. (Mexico)

2014-05-15T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


101

Three-dimensional imaging of copper pillars using x-ray tomography within a scanning electron microscope: A simulation study based on synchrotron data  

SciTech Connect (OSTI)

While microelectronic devices are frequently characterized with surface-sensitive techniques having nanometer resolution, interconnections used in 3D integration require 3D imaging with high penetration depth and deep sub-micrometer spatial resolution. X-ray tomography is well adapted to this situation. In this context, the purpose of this study is to assess a versatile and turn-key tomographic system allowing for 3D x-ray nanotomography of copper pillars. The tomography tool uses the thin electron beam of a scanning electron microscope (SEM) to provoke x-ray emission from specific metallic targets. Then, radiographs are recorded while the sample rotates in a conventional cone beam tomography scheme that ends up with 3D reconstructions of the pillar. Starting from copper pillars data, collected at the European Synchrotron Radiation Facility, we build a 3D numerical model of a copper pillar, paying particular attention to intermetallics. This model is then used to simulate physical radiographs of the pillar using the geometry of the SEM-hosted x-ray tomography system. Eventually, data are reconstructed and it is shown that the system makes it possible the quantification of 3D intermetallics volume in copper pillars. The paper also includes a prospective discussion about resolution issues.

Martin, N.; Bertheau, J.; Charbonnier, J.; Hugonnard, P.; Lorut, F. [ST Microelectronics, 850 Rue Jean Monnet, 38920 Crolles (France); Bleuet, P.; Tabary, J. [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Laloum, D. [ST Microelectronics, 850 Rue Jean Monnet, 38920 Crolles (France); CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France)

2013-02-15T23:59:59.000Z

102

Golden rule kinetics of transfer reactions in condensed phase: The microscopic model of electron transfer reactions in disordered solid matrices  

SciTech Connect (OSTI)

The algorithm for a theoretical calculation of transfer reaction rates for light quantum particles (i.e., the electron and H-atom transfers) in non-polar solid matrices is formulated and justified. The mechanism postulated involves a local mode (an either intra- or inter-molecular one) serving as a mediator which accomplishes the energy exchange between the reacting high-frequency quantum mode and the phonon modes belonging to the environment. This approach uses as a background the Fermi golden rule beyond the usually applied spin-boson approximation. The dynamical treatment rests on the one-dimensional version of the standard quantum relaxation equation for the reduced density matrix, which describes the frequency fluctuation spectrum for the local mode under consideration. The temperature dependence of a reaction rate is controlled by the dimensionless parameter ?{sub 0}=??{sub 0}/k{sub B}T where ?{sub 0} is the frequency of the local mode and T is the temperature. The realization of the computational scheme is different for the high/intermediate (?{sub 0} < 1 ? 3) and for low (?{sub 0}? 1) temperature ranges. For the first (quasi-classical) kinetic regime, the Redfield approximation to the solution of the relaxation equation proved to be sufficient and efficient in practical applications. The study of the essentially quantum-mechanical low-temperature kinetic regime in its asymptotic limit requires the implementation of the exact relaxation equation. The coherent mechanism providing a non-vanishing reaction rate has been revealed when T? 0. An accurate computational methodology for the cross-over kinetic regime needs a further elaboration. The original model of the hopping mechanism for electronic conduction in photosensitive organic materials is considered, based on the above techniques. The electron transfer (ET) in active centers of such systems proceeds via local intra- and intermolecular modes. The active modes, as a rule, operate beyond the kinetic regimes, which are usually postulated in the existing theories of the ET. Our alternative dynamic ET model for local modes immersed in the continuum harmonic medium is formulated for both classical and quantum regimes, and accounts explicitly for the mode/medium interaction. The kinetics of the energy exchange between the local ET subsystem and the surrounding environment essentially determine the total ET rate. The efficient computer code for rate computations is elaborated on. The computations are available for a wide range of system parameters, such as the temperature, external field, local mode frequency, and characteristics of mode/medium interaction. The relation of the present approach to the Marcus ET theory and to the quantum-statistical reaction rate theory [V. G. Levich and R. R. Dogonadze, Dokl. Akad. Nauk SSSR, Ser. Fiz. Khim. 124, 213 (1959); J. Ulstrup, Charge Transfer in Condensed Media (Springer, Berlin, 1979); M. Bixon and J. Jortner, Adv. Chem. Phys. 106, 35 (1999)] underlying it is discussed and illustrated by the results of computations for practically important target systems.

Basilevsky, M. V.; Mitina, E. A. [Photochemistry Center, Russian Academy of Sciences, 7a, Novatorov ul., Moscow (Russian Federation)] [Photochemistry Center, Russian Academy of Sciences, 7a, Novatorov ul., Moscow (Russian Federation); Odinokov, A. V. [Photochemistry Center, Russian Academy of Sciences, 7a, Novatorov ul., Moscow (Russian Federation) [Photochemistry Center, Russian Academy of Sciences, 7a, Novatorov ul., Moscow (Russian Federation); National Research Nuclear University “MEPhI,” 31, Kashirskoye shosse, Moscow (Russian Federation); Titov, S. V. [Karpov Institute of Physical Chemistry, 3-1/12, Building 6, Obuha pereulok, Moscow (Russian Federation)] [Karpov Institute of Physical Chemistry, 3-1/12, Building 6, Obuha pereulok, Moscow (Russian Federation)

2013-12-21T23:59:59.000Z

103

Electronic  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

contribution contribution to friction on GaAs: An atomic force microscope study Yabing Qi, 1,2 J. Y. Park, 2 B. L. M. Hendriksen, 2 D. F. Ogletree, 2 and M. Salmeron 2,3 1 Applied Science and Technology Graduate Group, University of California, Berkeley, California 94720, USA 2 Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720, USA 3 Department of Materials Sciences and Engineering, University of California, Berkeley, California 94720, USA ͑Received 23 January 2008; revised manuscript received 11 April 2008; published 7 May 2008͒ The electronic contribution to friction at semiconductor surfaces was investigated by using a Pt-coated tip with 50 nm radius in an atomic force microscope sliding against an n-type GaAs͑100͒ substrate. The GaAs surface was covered by an approximately 1 nm thick oxide layer. Charge accumulation

104

E-Print Network 3.0 - automated microscopic characterization...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

characterization problems with the help... in the electron optics, alignment and optimization of electron microscopes. Students will have plenty... of opportunities for hands-on...

105

Solid state optical microscope  

DOE Patents [OSTI]

A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal. 2 figs.

Young, I.T.

1983-08-09T23:59:59.000Z

106

Solid state optical microscope  

DOE Patents [OSTI]

A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

Young, Ian T. (Pleasanton, CA)

1983-01-01T23:59:59.000Z

107

FTIR Microscope | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

FTIR Microscope FTIR Microscope Two Bruker Fourier Transform Infrared (FTIR) spectrometers (IFS66 and IFS66V) with visible, near-, mid- and far-infrared (IR) capabilities are...

108

Spin microscope based on optically detected magnetic resonance  

DOE Patents [OSTI]

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2007-12-11T23:59:59.000Z

109

Spin microscope based on optically detected magnetic resonance  

DOE Patents [OSTI]

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2010-06-29T23:59:59.000Z

110

Spin microscope based on optically detected magnetic resonance  

DOE Patents [OSTI]

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of impaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2009-11-10T23:59:59.000Z

111

Spin microscope based on optically detected magnetic resonance  

DOE Patents [OSTI]

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Berman, Gennady P. (Los Alamos, NM); Chernobrod, Boris M. (Los Alamos, NM)

2009-10-27T23:59:59.000Z

112

Light and electron microscopic studies of the nanobenthic diatom, Nitzschia ovalis Arnott, Section Lanceolatae, as compared to related forms, and the effect of temperature and salinity on its growth rate  

E-Print Network [OSTI]

and the National Mar'ne Fisheries Service for the use of their Hitachi Transmission Electron Microscope under the auspices of Dr. N. H. Clark, Jr. This study was supported in part by a work ? study program provided by 5'~AA. Sincere gratitude is expressed... in Microdol-X (1:3), and printed on Kodabromide paper. , For TFM examinations, cleaned frustules were pipetted onto a formvar coated grid and air dried or critical point dried as previously described. The specimens were examined ?ith an Hitachi HS-8...

Medlin, Linda Karen

1977-01-01T23:59:59.000Z

113

Single atom identification by energy dispersive x-ray spectroscopy  

SciTech Connect (OSTI)

Using aberration-corrected scanning transmission electron microscope and energy dispersive x-ray spectroscopy, single, isolated impurity atoms of silicon and platinum in monolayer and multilayer graphene are identified. Simultaneously acquired electron energy loss spectra confirm the elemental identification. Contamination difficulties are overcome by employing near-UHV sample conditions. Signal intensities agree within a factor of two with standardless estimates.

Lovejoy, T. C.; Dellby, N.; Krivanek, O. L. [Nion, 1102 8th St., Kirkland, Washington 98033 (United States); Ramasse, Q. M. [SuperSTEM Laboratory, STFC Daresbury, Keckwick Lane, Daresbury WA4 4AD (United Kingdom); Falke, M.; Kaeppel, A.; Terborg, R. [Bruker Nano GmbH, Schwarzschildstr. 12, 12489 Berlin (Germany); Zan, R. [School of Physics and Astronomy, University of Manchester, Manchester M13 9PL (United Kingdom)

2012-04-09T23:59:59.000Z

114

Helium Ion Microscope | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

other characterization capabilities. User Portal Name: Helium Ion Microscope Instrument ID: 34104 Availability: 10 hours a day, 5 days a week Facility: Quiet Wing Quick Specs...

115

Solid-state optical microscope  

DOE Patents [OSTI]

A solid state optical microscope is described wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. Means for scanning in one of two orthogonal directions are provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

Young, I.T.

1981-01-07T23:59:59.000Z

116

Astronomy by microscope  

Science Journals Connector (OSTI)

......August 2009 research-article Features Astronomy by microscope Monica M Grady reviews the astronomy revealed in samples of solar system material...of the Natural History Museum, London. Astronomy is the study of stars (and galaxies......

Monica M Grady

2009-08-01T23:59:59.000Z

117

Microscope collision protection apparatus  

DOE Patents [OSTI]

A microscope collision protection apparatus for a remote control microscope which protects the optical and associated components from damage in the event of an uncontrolled collision with a specimen, regardless of the specimen size or shape. In a preferred embodiment, the apparatus includes a counterbalanced slide for mounting the microscope's optical components. This slide replaces the rigid mounts on conventional upright microscopes with a precision ball bearing slide. As the specimen contacts an optical component, the contacting force will move the slide and the optical components mounted thereon. This movement will protect the optical and associated components from damage as the movement causes a limit switch to be actuated, thereby stopping all motors responsible for the collision.

DeNure, Charles R. (Pocatello, ID)

2001-10-23T23:59:59.000Z

118

Infrared microscope inspection apparatus  

DOE Patents [OSTI]

Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.

Forman, S.E.; Caunt, J.W.

1985-02-26T23:59:59.000Z

119

Infrared microscope inspection apparatus  

DOE Patents [OSTI]

Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface.

Forman, Steven E. (Framingham, MA); Caunt, James W. (Concord, MA)

1985-02-26T23:59:59.000Z

120

Raman and electron microscopic studies of Si{sub 1-x}Ge{sub x} alloy nanowires grown by chemical vapor deposition  

SciTech Connect (OSTI)

Si{sub 1-x}Ge{sub x} alloy nanowires (SiGeNWs) were grown by Au-catalyzed chemical vapor deposition and studied by Raman spectroscopy, transmission electron microscopy (TEM), and energy-dispersive x-ray spectroscopy (EDS) in TEM (TEM-EDS). The relationship between the growth parameters and the structure of the SiGeNWs was clarified by systematically changing the growth conditions over a wide range. Raman and TEM-EDS results demonstrated that the SiGeNWs consist of a lower Ge composition core and a higher Ge composition shell epitaxially grown on the surface of the core. The effects of oxidation on the structure of the SiGeNWs were studied. It was found that oxidation leads to segregation of the Ge atoms at the interface between the SiGeNWs and SiO{sub 2}, which in turn results in a large inhomogeneity in Ge composition. Oxidation at a very low rate in a diluted oxygen gas atmosphere is required to avoid the formation of Ge particles and minimize the inhomogeneity.

Kawashima, Takahiro; Imamura, Goh; Fujii, Minoru; Hayashi, Shinji; Saitoh, Tohru; Komori, Kazunori [Advanced Devices Development Center, Matsushita Electric Industrial Co., Ltd., 3-1-1 Yagumo-Nakamachi, Moriguchi, Osaka 570-8501 (Japan); Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe 657-8501 (Japan); Image Devices Development Center, Matsushita Electric Industrial Co., Ltd., 3-1-1 Yagumo-Nakamachi, Moriguchi, Osaka 570-8501 (Japan)

2007-12-15T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


121

The Reflecting Microscope  

Science Journals Connector (OSTI)

...INVESTIGATION OF CATADIOPTRIC SCHWARZSCHILD SYSTEMS, JOURNAL OF THE OPTICAL...PHYSIOLOGY 32 : 489 ( 1949 ). SCHWARZSCHILD, K, GESELLSCHAFT WISS MP...USE OF REFLECTING SYSTEMS of mirror-pairs in microscope objectives...0.65 with an aspheric mirror-pair of Schwarzsehild...

Robert C. Mellors

1950-10-06T23:59:59.000Z

122

Development of High Voltage Electron Microscope  

Science Journals Connector (OSTI)

......Cockcroft Walton Type High Voltage Generator. O Power Line O Fig. 4...pressure in the tank to the atmospheric pressure by removing freon...pump using liquid nitrogen. Water buffer and liquid nitrogen...base plate of high voltage generator. Four poles stand on this......

Shinjiro KATAGIRI; Hirokazu KIMURA; Susumu OZASA; Kazumi SHIRAISHI

1969-01-01T23:59:59.000Z

123

Electron Microscopical Investigations of Organic Solar Cells.  

E-Print Network [OSTI]

??Diese Arbeit behandelt die Analyse der Nanomorphologie von organischen Solarzellen, welchen einen großen Einfluss auf die Effizienz der Zelle hat. Ein breites Spektrum elektronenmikroskopischer Techniken… (more)

Pfaff, Marina

2013-01-01T23:59:59.000Z

124

Cryo-Transmission Electron Microscope (TEM) | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

film consisting of glucose oxidasePtfunctional graphene sheetschitosan (GODPtFGSchitosan) for glucose sensing was... Multiplexed Electrochemical Immunoassay of...

125

Ion photon emission microscope  

DOE Patents [OSTI]

An ion beam analysis system that creates microscopic multidimensional image maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the ion-induced photons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted photons are collected in the lens system of a conventional optical microscope, and projected on the image plane of a high resolution single photon position sensitive detector. Position signals from this photon detector are then correlated in time with electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these photons initially.

Doyle, Barney L. (Albuquerque, NM)

2003-04-22T23:59:59.000Z

126

the microscopic description  

E-Print Network [OSTI]

at the Bragg peak Penetration Energy Stopping power dE/dx Electronic stopping Nuclear stopping Insulator gap How is energy deposited (ions...) Water Relativedose(%) Depth (mm) Energy Dose and dosimetry Energy electronic stopping Low Energy nuclear stopping Direct DNA ionization (photons, electron impact

Giraud, Olivier

127

Electron  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

to measure the electron density gradient and its fluctuations. Two separate laser beams with slight spatial offset and frequency difference are coupled into a single mixer...

128

Fluorescence, Single-Molecule Microscope | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Single-Molecule Microscope Fluorescence, Single-Molecule Microscope The single-molecule optical microscope is designed to study complex reaction dynamics such as enzymatic...

129

A Microscopic Double-Slit Experiment  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

A Microscopic Double-Slit A Microscopic Double-Slit Experiment A Microscopic Double-Slit Experiment Print Wednesday, 29 February 2012 00:00 Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in establishing the validity of wave-particle duality, a puzzling concept that has ultimately become central to the interpretation of complementarity in quantum mechnanics. In a new twist on this classic experiment, the double slit (with light waves) has been replaced by a diatomic molecule (with electron waves). At ALS Beamline 10.0.1, researchers have shown that diatomic molecules can serve as two-center emitters of electron waves and that traces of electron-wave interference can be directly observed in precise measurements of vibrationally resolved photoionization spectra.

130

Atomic Force Microscope  

SciTech Connect (OSTI)

The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

Day, R.D.; Russell, P.E.

1988-12-01T23:59:59.000Z

131

Sandia National Laboratories: News: Publications: Lab News  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

June 1, 2012 June 1, 2012 Small worlds come into focus with new Sandia instrument PRINCIPAL INVESTIGATORS Paul Kotula, left, and Ping Lu (both 1822) show off Sandia's new aberration-corrected scanning transmission electron microscope, which has a unique combination of X-ray detectors and very high resolution and is capable of doing analyses in far less time than the Labs' older analytic microscope. (Photo by Randy Montoya) View large image. by Sue Major Holmes Paul Kotula recently told a colleague at another laboratory that Sandia's new aberration-corrected scanning transmission electron microscope (AC-STEM) was like a Lamborghini with James Bond features. The $3.2 million FEI Titan G2 8200 Sandia accepted in February is 50 to 100 times better than what went before in terms of resolution and the time it

132

A compact scanning soft X-ray microscope  

SciTech Connect (OSTI)

Soft x-ray microscopes operating at wavelengths between 2.3 nm and 4.4 nm are capable of imaging wet biological cells with a resolution many times that of a visible light microscope. Several such soft x-ray microscopes have been constructed. However, with the exception of contact microscopes, all use synchrotrons as the source of soft x-ray radiation and Fresnel zone plates as the focusing optics. These synchrotron based microscopes are very successful but have the disadvantage of limited access. This dissertation reviews the construction and performance of a compact scanning soft x-ray microscope whose size and accessibility is comparable to that of an electron microscope. The microscope uses a high-brightness laser-produced plasma as the soft x-ray source and normal incidence multilayer-coated mirrors in a Schwarzschild configuration as the focusing optics. The microscope operates at a wavelength of 14 nm, has a spatial resolution of 0.5 {mu}m, and has a soft x-ray photon flux through the focus of 10{sup 4}-10{sup 5} s{sup {minus}1} when operated with only 170 mW of average laser power. The complete system, including the laser, fits on a single 4{prime} x 8{prime} optical table. The significant components of the compact microscope are the laser-produced plasma (LPP) source, the multilayer coatings, and the Schwarzschild objective. These components are reviewed, both with regard to their particular use in the current microscope and with regard to extending the microscope performance to higher resolution, higher speed, and operation at shorter wavelengths. Measurements of soft x-ray emission and debris emission from our present LPP source are presented and considerations given for an optimal LPP source. The LPP source was also used as a broadband soft x-ray source for measurement of normal incidence multilayer mirror reflectance in the 10-25 nm spectral region.

Trail, J.A.

1989-01-01T23:59:59.000Z

133

Electron  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron thermal transport within magnetic islands in the reversed-field pinch a... H. D. Stephens, 1,b D. J. Den Hartog, 1,3 C. C. Hegna, 1,2 and J. A. Reusch 1 1 Department of...

134

Electron  

Science Journals Connector (OSTI)

Absolute grand total cross sections (TCSs) for electron-disilane (Si2H6) scattering have been measured over the energy range from 1 to 370 eV in a linear transmission experiment. The low-energy TCS is dominated by a broad resonant-like enhancement. In the region of the maximum the present grand TCS values appeared to be distinctly lower than previously reported integral elastic cross section data. A comparison of total electron scattering cross sections for the two simplest silicon hydrides and relevant hydrocarbons is given.

Czeslaw Szmytkowski; Pawel Mozejko; Grzegorz Kasperski

2001-01-01T23:59:59.000Z

135

A Microscopic Double-Slit Experiment  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

A Microscopic Double-Slit Experiment Print A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in establishing the validity of wave-particle duality, a puzzling concept that has ultimately become central to the interpretation of complementarity in quantum mechnanics. In a new twist on this classic experiment, the double slit (with light waves) has been replaced by a diatomic molecule (with electron waves). At ALS Beamline 10.0.1, researchers have shown that diatomic molecules can serve as two-center emitters of electron waves and that traces of electron-wave interference can be directly observed in precise measurements of vibrationally resolved photoionization spectra.

136

A Microscopic Double-Slit Experiment  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

A Microscopic Double-Slit Experiment Print A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in establishing the validity of wave-particle duality, a puzzling concept that has ultimately become central to the interpretation of complementarity in quantum mechnanics. In a new twist on this classic experiment, the double slit (with light waves) has been replaced by a diatomic molecule (with electron waves). At ALS Beamline 10.0.1, researchers have shown that diatomic molecules can serve as two-center emitters of electron waves and that traces of electron-wave interference can be directly observed in precise measurements of vibrationally resolved photoionization spectra.

137

Epi-Fluorescence Inverted Microscope (Zeiss,  

E-Print Network [OSTI]

Epi-Fluorescence Inverted Microscope (Zeiss, Observer Z1) April 2013 #12;Start Up cont. · Turn) #12;Using the Microscope cont. · On an inverted microscope samples on a glass slide are usually viewed

Subramanian, Venkat

138

Coherence-controlled holographic microscope  

Science Journals Connector (OSTI)

Transmitted-light coherence-controlled holographic microscope (CCHM) based on an off-axis achromatic interferometer allows us to use light sources of arbitrary degree of temporal and...

Kolman, Pavel; Chmelík, Radim

2010-01-01T23:59:59.000Z

139

ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS, VOL. 83 LVSEM for High Resolution Topographic and Density  

E-Print Network [OSTI]

ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS, VOL. 83 LVSEM for High Resolution Topographic Surface-Imaging Scanning Electron Microscope 205 C. Electrons as Probes in Scanning Microscopes 205 D. Limitations Associated with the Use of Electrons as the Probing Radiation 206 E. Response to These Limitations

Pawley, James

140

MICROSCOPIC USES OF NANOGOLD.  

SciTech Connect (OSTI)

Gold has been used for immunocytochemistry since 1971 when Faulk and Taylor discovered adsorption of antibodies to colloidal gold. It is an ideal label for electron microscopy (EM) due to its high atomic number, which scatters electrons efficiently, and the fact that preparative methods have been developed to make uniform particles in the appropriate size range of 5 to 30 nm. Use in light microscopy (LM) generally requires silver enhancement (autometallography; AMG) of these small gold particles. Significant advances in this field since that time have included a better understanding of the conditions for best antibody adsorption, more regular gold size production, adsorption of other useful molecules, like protein A, and advances in silver enhancement. Many studies have also been accomplished showing the usefulness of these techniques to cell biology and biomedical research. A further advance in this field was the development of Nanogold{trademark}, a 1.4 nm gold cluster. A significant difference from colloidal gold is that Nanogold is actually a coordination compound containing a gold core covalently linked to surface organic groups. These in turn may be covalently attached to antibodies. This approach to immunolabeling has several advantages compared to colloidal gold such as vastly better penetration into tissues, generally greater sensitivity, and higher density of labeling. Since Nanogold is covalently coupled to antibodies, it may also be directly coupled to almost any protein, peptide, carbohydrate, or molecule of interest, including molecules which do not adsorb to colloidal gold. This increases the range of probes possible, and expands the applications of gold labeling.

HAINFELD,J.F.POWELL,R.D.FURUYA,F.R.

2003-04-17T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


141

Reading Comprehension - Dissecting and Compound Microscopes  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Dissecting and Compound Microscopes Two types of microscopes. _________ Dissecting and Compound Microscopes Two types of microscopes. _________ Dissecting Microscope Compound Microscope _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ eyepiece focus knob light light switch objective stage _________ Dissecting Microscope Compound Microscope _________ eyepieces focus knob light light switch objective stage _________ eyepieces focus knob light light switch objective stage _________ eyepieces focus knob light light switch objective stage _________ eyepieces focus knob light

142

Science, Optics and You: Microscopes and Crystals  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

glass), and the field microscope. (The hand lens and field microscope are in your Science, Optics and You package.) Activity 14 provides instructions for making different...

143

E-Print Network 3.0 - adaptive aberration correction Sample Search...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

de Murcia Collection: Engineering ; Physics 36 Modeling Measuring and Correcting the LCA of theModeling Measuring and Correcting the LCA of the Human EyeHuman Eye Summary:...

144

E-Print Network 3.0 - aberration-corrected scanning transmission...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

de Gnie Physique, cole Polytechnique de Montral Collection: Engineering 76 Identification and lattice location of oxygen impurities in -Si3N4 J. C. Idrobo,1,2,3,a...

145

Microscopy. II. Electron Microscopy: A Review  

Science Journals Connector (OSTI)

...the best image under the lower resolving power of optical microscopes. For example...Experimental Infection with the Virus of Foot and Mouth Disease. J. Exper. Med...Further Improvements in the Resolving Power of the Electron Microscope. J. Appi...

Cecily Cannan Selby

1953-11-01T23:59:59.000Z

146

Installation of the MAXIMUM microscope at the ALS  

SciTech Connect (OSTI)

The MAXIMUM scanning x-ray microscope, developed at the Synchrotron Radiation Center (SRC) at the University of Wisconsin, Madison was implemented on the Advanced Light Source in August of 1995. The microscope`s initial operation at SRC successfully demonstrated the use of multilayer coated Schwarzschild objective for focusing 130 eV x-rays to a spot size of better than 0.1 micron with an electron energy resolution of 250meV. The performance of the microscope was severely limited, because of the relatively low brightness of SRC, which limits the available flux at the focus of the microscope. The high brightness of the ALS is expected to increase the usable flux at the sample by a factor of 1,000. The authors will report on the installation of the microscope on bending magnet beamline 6.3.2 at the ALS and the initial measurement of optical performance on the new source, and preliminary experiments with surface chemistry of HF etched Si will be described.

Ng, W.; Perera, R.C.C.; Underwood, J.H. [Lawrence Berkeley Lab., CA (United States); Singh, S.; Solak, H.; Cerrina, F. [Univ. of Wisconsin, Stoughton, WI (United States). Center for X-ray Lithography

1995-10-01T23:59:59.000Z

147

The History of the Microscope  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

the Microscope the Microscope Nature Bulletin No. 506 November 9, 1957 Forest Preserve District of Cook County Daniel Ryan, President Roberts Mann, Conservation Editor David H. Thompson, Senior Naturalist THE HISTORY OF THE MICROSCOPE During that historic period known as the Renaissance, after the "dark" Middle Ages, there occurred the inventions of printing, gunpowder and the mariner's compass, followed by the discovery of America. Equally remarkable was the invention of the microscope: an instrument that enables the human eye, by means of a lens or combinations of lenses, to observe enlarged images of tiny objects. It made visible the fascinating details of worlds within worlds. Long before, in the hazy unrecorded past, someone picked up a piece of transparent crystal thicker in the middle than at the edges, looked through it, and discovered that it made things look larger. Someone also found that such a crystal would focus the sun's rays and set fire to a piece of parchment or cloth. Magnifiers and "burning glasses" are mentioned in the writings of Seneca and Pliny the Elder, Roman philosophers during the first century A. D., but apparently they were not used much until the invention of spectacles, toward the end of the 13th century. They were named lenses because they are shaped like the seeds of a lentil.

148

Workshop on EELS and EDS, May 21-23, 2012  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

and Electronic Behavior Using EELS and Aberration Corrected STEM" Marek Malac, NINT, Canada "Angle- and Spatially-Resolved EELS" Matt Libera, Stevens Institute of Technology...

149

Atomic Force Compound Microscope | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

and spectroscopic characterization simultaneously for imaging biological... Intermittent Single-Molecule Interfacial Electron Transfer Dynamics. We report on single molecule...

150

From electron energy-loss spectroscopy to multi-dimensional and multi-signal electron microscopy  

Science Journals Connector (OSTI)

......4 Colliex C . Electron Energy Loss Spectroscopy in the...eds. (1984) Vol. 9. New York: Academic Press. 65-177. 5 Egerton R . Electron Energy Loss Spectroscopy in the Electron Microscope (1986) New York: Plenum Press. 6 Isaacson......

Christian Colliex

2011-08-01T23:59:59.000Z

151

Sensing mode atomic force microscope  

DOE Patents [OSTI]

An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

Hough, Paul V. C. (Port Jefferson, NY); Wang, Chengpu (Upton, NY)

2003-01-01T23:59:59.000Z

152

Los Alamos: MST: MST-6: EML: Electron Microscopy Laboratory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) FEI Strata DB235 FIB/SEM (Focused Ion Beam/High Reolution Scanning Electron Microscope) This is a versatile field emission scanning electron microscope integrated with a focused ion beam column that is used for sophisticated SEM and TEM sample preparation, micromachining, and ultrahigh resolution SEM imaging. The microscope is also equipped for x-ray microanalysis and crystallographic orientation imaging. Microscope consists of a Hexalens SFEG electron beam column, and a Magnum ion beam column with a gallium liquid metal ion source. Imaging with both secondary electrons and ions. Digital image acquisition. Small, stable, high brightness Schottky based field emission electron source provides 1.5 nm resolution at 30 kV. Three electron beam lens modes - normal imaging, high resolution imaging, and EDS imaging.

153

A New Cubic B-C-N Compound Revealed by High-Resolution Analytical Electron Microscopy  

Science Journals Connector (OSTI)

......nitride by electron energy-loss spectroscopy...Egerton RF: Electron energy loss spectroscopy...electron microscope. New York and London: Plenum...electron microscopy. New York: Plenum Press...system by electron energy loss spectroscopy......

Yoshio Bando; Satoshi Nakano; Keiji Kurashima

1996-04-01T23:59:59.000Z

154

EMSL: Publications - Brochures  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Brochures Brochures Become an EMSL User EMSL's Impact Accelerating Innovation Across America Grand Challenge Demonstrates Team Science, Generates Systems Understanding of Cyanobacterium EMSL/PNNL Catalysis Work Supports Cleaner, More Efficient Cummins/Dodge Engines Capability Groups at EMSL EMSL State-of-the-Art Capabilities Cell Isolation & Systems Analysis Deposition and Microfabrication Mass Spectrometry Microscopy Molecular Science Computing NMR and EPR Spectroscopy and Diffraction Subsurface Flow and Transport Instruments at EMSL Instruments Available to Users Instrument Series: Deposition and Microfabrication - Sputter Deposition System Instrument Series: Microscopy - Helium Ion Microscope Instrument Series: Microscopy - Aberration-Corrected Scanning/Transmission Electron Microscope (S/TEM)

155

Scanning evanescent electro-magnetic microscope  

DOE Patents [OSTI]

A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

Xiang, Xiao-Dong (Alameda, CA); Gao, Chen (Alameda, CA)

2001-01-01T23:59:59.000Z

156

E-Print Network 3.0 - analytical scanning electron Sample Search...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Microscope Philips CM20 Analytical Scanning... during formation of the carbide particles. 12;Philips CM20 Analytical Scanning Transmission Electron... at SCSAM ...

157

Robotic CCD microscope for enhanced crystal recognition  

DOE Patents [OSTI]

A robotic CCD microscope and procedures to automate crystal recognition. The robotic CCD microscope and procedures enables more accurate crystal recognition, leading to fewer false negative and fewer false positives, and enable detection of smaller crystals compared to other methods available today.

Segelke, Brent W. (San Ramon, CA); Toppani, Dominique (Livermore, CA)

2007-11-06T23:59:59.000Z

158

Microscopic nonequilibrium theory of quantum well solar cells  

Science Journals Connector (OSTI)

We present a microscopic theory of bipolar quantum well structures in the photovoltaic regime, based on the nonequilibrium Green’s function formalism for a multiband tight-binding Hamiltonian. The quantum kinetic equations for the single particle Green’s functions of electrons and holes are self-consistently coupled to Poisson’s equation, including intercarrier scattering on the Hartree level. Relaxation and broadening mechanisms are considered by the inclusion of acoustic and optical electron-phonon interaction in a self-consistent Born approximation of the scattering self-energies. Photogeneration of carriers is described on the same level in terms of a self-energy derived from the standard dipole approximation of the electron-photon interaction. Results from a simple two-band model are shown for the local density of states, spectral response, current spectrum, and current-voltage characteristics for generic single quantum well systems.

U. Aeberhard and R. H. Morf

2008-03-28T23:59:59.000Z

159

Disorder-Induced Microscopic Magnetic Memory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Disorder-Induced Microscopic Disorder-Induced Microscopic Magnetic Memory Disorder-Induced Microscopic Magnetic Memory Print Wednesday, 26 October 2005 00:00 The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments, an American-European team, led by researchers from the University of Washington, Seattle, first developed and then applied coherent x-ray speckle metrology to microscopic magnetic domains in a series of thin multilayer perpendicular magnetic materials of varying disorder. Their results, at odds with all previous theories, have set a new reference point for future theories.

160

NCEM National Center for Electron Microscopy: Microscopes and Facilities:  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

3010 In-Situ 3010 In-Situ AEME The 300 kV JEOL 3010 offers greater specimen penetration than 200kV instruments, with significantly improved spatial resolution and probe forming capabilities. The side-entry stage allows ±45° tilt and can be operated with piezo-drift compensation. A flexible condenser system permits CBED, LACBED, and imaging with hollow cone and Koehler illumination. In addition to a standard film camera, a Gatan Orius CCD, and a Gatan 622 intensified TV camera and VCR are available for recording experiments at video rates. Specific capabilities include: high-resolution imaging at 2.1Å and ±40° tilt during simultaneous heating; very-high-resolution imaging at 1.7 Å and ±10° tilt during simultaneous heating; and high magnification Lorentz and Foucault imaging of magnetic samples. Various

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


161

COLONIAL GROWTH OF MYCOPLASMA GALLISEPTICUM OBSERVED WITH THE ELECTRON MICROSCOPE  

Science Journals Connector (OSTI)

...Hillier, and Mudd (1948), Reagan, Brueckner, and Delaplane (1951), Reagan, Day, and Brueckner (1953), and White, Wallace, and Alberts...697- 717. REAGAN, R. L., A. L. BRUECKNER, AND J. P. DELAPLANE. 1951. Morphological...

Moshe Shifrine; Jack Pangborn; Henry E. Adler

1962-01-01T23:59:59.000Z

162

Four generations of high-voltage electron microscopes  

Science Journals Connector (OSTI)

......TM' py and Analysis, ed. Nixon , , , , , ,, , , , W C, p. 188, (Institute of Physics Conf. Series Nr. 10, London ceed only if the ballistic exchange rate exceeds the thermal a n d Bristol). rate sufficiently. This implies that the transformation......

Alfred Seeger

1999-01-01T23:59:59.000Z

163

Optical design of electron microscope lenses and energy filters  

Science Journals Connector (OSTI)

......Two-stage elearon energy analyzer Czech Republic...Academic Press New York) piece for a transmission...Academic Press, New York). 47 Tang T T...T.!.!.2 : Energy-filtering Transmission...Proposal of a new energy filter for TEM......

K Tsuno

1999-01-01T23:59:59.000Z

164

Low Temperature Stage in Electron Microscope for Study on Superconductors  

Science Journals Connector (OSTI)

......superconductors. The elementary magnetic property of superconductors...of the superconducting resistance-transition must be connected...stage to be movable. 2. Electric lead wires Electric lead...experiment by measuring the resistance of the specimen by the......

Tomoyuki MIYAZAKI; Ryozo AOKI; Bunjyu SHINOZAKI; Shigeru YAMASHITA

1980-01-01T23:59:59.000Z

165

Electron microscopic and voltammetric analysis of carbon fibre electrode pretreatments  

Science Journals Connector (OSTI)

The comparison between the differential pulse voltammetric capability of untreated or treated 12 µm or 30 µm diameter carbon fibre electrodes (CFE) to detect electroactive compoundsin vitro...has been analysed. T...

T. J. Self; F. Crespi

1992-11-01T23:59:59.000Z

166

Electron Microscopy Lab  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Facilities » Facilities » Electron Microscopy Lab Electron Microscopy Lab Focusing on the study of microstructures with electron and ion beam instruments, including crystallographic and chemical techniques. April 12, 2012 Transmission electron microscope Rob Dickerson examines a multiphase oxide scale using the FEI Titan 80-300 transmission electron microscope. Contact Rob Dickerson (505) 667-6337 Email Rod McCabe (505) 606-1649 Email Pat Dickerson (505) 665-3036 Email Tom Wynn (505) 665-6861 Email Dedicated to the characterization of materials through imaging, chemical, and crystallographic analyses of material microstructures in support of Basic Energy Science, Laboratory Directed Research and Development, DoD, DOE, Work for Others, nuclear energy, and weapons programs. Go to full website »

167

Microscopic aspects of the Staebler-Wronski effect  

SciTech Connect (OSTI)

The microscopic origin and the creation mechanisms of metastable, light-induced defects in hydrogenated amorphous silicon are reviewed. Based on excitonic electron-hole pair recombination, a consistent quantitative description of defect creation kinetics can be obtained, including the experimentally observed differences between continuous wave and pulsed illumination as well as the effect of competing recombination pathways in compensated material. High resolution spin resonance spectra obtained by low-field spin-dependent transport are used to examine the interaction of metastable defects with hydrogen.

Stutzmann, M.

1997-07-01T23:59:59.000Z

168

Disorder-Induced Microscopic Magnetic Memory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Disorder-Induced Microscopic Magnetic Memory Print Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments, an American-European team, led by researchers from the University of Washington, Seattle, first developed and then applied coherent x-ray speckle metrology to microscopic magnetic domains in a series of thin multilayer perpendicular magnetic materials of varying disorder. Their results, at odds with all previous theories, have set a new reference point for future theories.

169

Disorder-Induced Microscopic Magnetic Memory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Disorder-Induced Microscopic Magnetic Memory Print Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments, an American-European team, led by researchers from the University of Washington, Seattle, first developed and then applied coherent x-ray speckle metrology to microscopic magnetic domains in a series of thin multilayer perpendicular magnetic materials of varying disorder. Their results, at odds with all previous theories, have set a new reference point for future theories.

170

Variable Temperature Scanning Probe Microscope | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

EMSL's ultra-high vacuum, variable-temperature scanning probe microscope system, or UHV VT SPM, is a state-of-the-art surface science tool comprising multiple complementary...

171

Soft x-ray laser microscope  

SciTech Connect (OSTI)

The program consisted of two phases (Phase I and Phase II). The goal of the Phase I (first year program) was to design and construct the Soft X-ray Laser Contact Microscope. Such microscope was constructed and adapted to PPL's 18.2nm soft X-ray Laser (SXL), which in turn was modified and prepared for microscopy experiments. Investigation of the photoresist response to 18.2nm laser radiation and transmissivity of 0.1m thick silicion-nitride (Si[sub 3]N[sub 4]) windows were important initial works. The goal of the first year of Phase II was to construct X-ray contact microscope in combination with existing optical phase microscope, already used by biologists. In the second year of Phase II study of dehydrated Horeseshoe Crab and Hela cancer cells were performed with COXRALM. Also during Phase II, the Imaging X-Ray Laser Microscope (IXRALM) was designed and constructed. This paper describes the development of each of the microscopes and their application for research.

Suckewer, P.I.

1990-10-01T23:59:59.000Z

172

X-ray laser microscope apparatus  

DOE Patents [OSTI]

A microscope consisting of an x-ray contact microscope and an optical microscope. The optical, phase contrast, microscope is used to align a target with respect to a source of soft x-rays. The source of soft x-rays preferably comprises an x-ray laser but could comprise a synchrotron or other pulse source of x-rays. Transparent resist material is used to support the target. The optical microscope is located on the opposite side of the transparent resist material from the target and is employed to align the target with respect to the anticipated soft x-ray laser beam. After alignment with the use of the optical microscope, the target is exposed to the soft x-ray laser beam. The x-ray sensitive transparent resist material whose chemical bonds are altered by the x-ray beam passing through the target mater GOVERNMENT LICENSE RIGHTS This invention was made with government support under Contract No. De-FG02-86ER13609 awarded by the Department of Energy. The Government has certain rights in this invention.

Suckewer, Szymon (Princeton, NJ); DiCicco, Darrell S. (Plainsboro, NJ); Hirschberg, Joseph G. (Coral Gables, FL); Meixler, Lewis D. (East Windsor, NJ); Sathre, Robert (Princeton, NJ); Skinner, Charles H. (Lawrenceville, NJ)

1990-01-01T23:59:59.000Z

173

Variable Temperature Ultra-High Vacuum Scanning Tunneling Microscope...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Vacuum Scanning Tunneling Microscope The Omicron variable temperature ultra-high vacuum (UHV) scanning tunneling microscope (VTSTM) is designed to study the structure of both clean...

174

Single-Molecule Flourescence/Patch Clamp Microscope | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Single-Molecule FlourescencePatch Clamp Microscope Single-Molecule FlourescencePatch Clamp Microscope At EMSL, researchers use the single-molecule fluorescencepatch clamp...

175

Highly charged ion based time of flight emission microscope  

DOE Patents [OSTI]

A highly charged ion based time-of-flight emission microscope has been designed, which improves the surface sensitivity of static SIMS measurements because of the higher ionization probability of highly charged ions. Slow, highly charged ions are produced in an electron beam ion trap and are directed to the sample surface. The sputtered secondary ions and electrons pass through a specially designed objective lens to a microchannel plate detector. This new instrument permits high surface sensitivity (10.sup.10 atoms/cm.sup.2), high spatial resolution (100 nm), and chemical structural information due to the high molecular ion yields. The high secondary ion yield permits coincidence counting, which can be used to enhance determination of chemical and topological structure and to correlate specific molecular species.

Barnes, Alan V. (Livermore, CA); Schenkel, Thomas (San Francisco, CA); Hamza, Alex V. (Livermore, CA); Schneider, Dieter H. (Livermore, CA); Doyle, Barney (Albuquerque, NM)

2001-01-01T23:59:59.000Z

176

Mapping the Valence States of Transition-Metal Elements Using Energy-Filtered Transmission Electron Microscopy  

E-Print Network [OSTI]

spectrum of MnO2 acquired at 200 kV using a Hitachi HF-2000 transmission electron microscope equipped lines observed in electron energy-loss spectroscopy in a transmission electron microscope (TEMMapping the Valence States of Transition-Metal Elements Using Energy-Filtered Transmission Electron

Wang, Zhong L.

177

Dynamic imaging with electron microscopy  

ScienceCinema (OSTI)

Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

2014-05-30T23:59:59.000Z

178

Dynamic imaging with electron microscopy  

SciTech Connect (OSTI)

Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

2014-02-20T23:59:59.000Z

179

Magnitude of speed of sound aberration corrections for ultrasound image guided radiotherapy for prostate and other anatomical sites  

SciTech Connect (OSTI)

Purpose: The purpose of this work is to assess the magnitude of speed of sound (SOS) aberrations in three-dimensional ultrasound (US) imaging systems in image guided radiotherapy. The discrepancy between the fixed SOS value of 1540 m/s assumed by US systems in human soft tissues and its actual nonhomogeneous distribution in patients produces small but systematic errors of up to a few millimeters in the positions of scanned structures. Methods: A correction, provided by a previously published density-based algorithm, was applied to a set of five prostate, five liver, and five breast cancer patients. The shifts of the centroids of target structures and the change in shape were evaluated. Results: After the correction the prostate cases showed shifts up to 3.6 mm toward the US probe, which may explain largely the reported positioning discrepancies in the literature on US systems versus other imaging modalities. Liver cases showed the largest changes in volume of the organ, up to almost 9%, and shifts of the centroids up to more than 6 mm either away or toward the US probe. Breast images showed systematic small shifts of the centroids toward the US probe with a maximum magnitude of 1.3 mm. Conclusions: The applied correction in prostate and liver cancer patients shows positioning errors of several mm due to SOS aberration; the errors are smaller in breast cancer cases, but possibly becoming more important when breast tissue thickness increases.

Fontanarosa, Davide; Meer, Skadi van der; Bloemen-van Gurp, Esther; Stroian, Gabriela; Verhaegen, Frank [Department of Radiation Oncology (MAASTRO), GROW - School for Oncology and Developmental Biology, Maastricht University Medical Center, Maastricht 6201 BN (Netherlands); Radiation Oncology Department, SMBD Jewish General Hospital, Montreal, Quebec H3T 1E2 (Canada); Department of Radiation Oncology (MAASTRO), GROW - School for Oncology and Developmental Biology, Maastricht University Medical Center, Maastricht 6201 BN (Netherlands) and Oncology Department, McGill University, Montreal, Quebec H3G 1A4 (Canada)

2012-08-15T23:59:59.000Z

180

Fast electron microscopy via compressive sensing  

DOE Patents [OSTI]

Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

2014-12-09T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


181

Atomic configuration of irradiation-induced planar defects in 3C-SiC  

SciTech Connect (OSTI)

The atomic configuration of irradiation-induced planar defects in single crystal 3C-SiC at high irradiation temperatures was shown in this research. A spherical aberration corrected scanning transmission electron microscope provided images of individual silicon and carbon atoms by the annular bright-field (ABF) method. Two types of irradiation-induced planar defects were observed in the ABF images including the extrinsic stacking fault loop with two offset Si-C bilayers and the intrinsic stacking fault loop with one offset Si-C bilayer. The results are in good agreement with images simulated under identical conditions.

Lin, Y. R. [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); National Synchrotron Radiation Center, 101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu 30076, Taiwan (China); Ho, C. Y. [Institute of Nuclear Engineering and Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Hsieh, C. Y.; Chang, M. T.; Lo, S. C. [Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, Taiwan (China); Chen, F. R. [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Kai, J. J., E-mail: ceer0001@gmail.com [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Institute of Nuclear Engineering and Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China)

2014-03-24T23:59:59.000Z

182

High energy-resolution electron energy-loss spectroscopy study of the electric structure of double-walled carbon nanotubes  

Science Journals Connector (OSTI)

......High energy-resolution electron energy-loss spectroscopy study of the...Egerton R F. (1986) Electron Energy-Loss Spectroscopy in the Electron Microscope , Plenum, New York. High energy-resolution electron energy-loss......

Yohei Sato; Masami Terauchi; Yahachi Saito; Riichiro Saito

2006-06-01T23:59:59.000Z

183

Young’s double-slit interference experiment with electrons  

Science Journals Connector (OSTI)

In this short Note we report a method for producing samples containing two nano-sized slits suitable for demonstrating to undergraduate and graduate students the double-slit electron interference experiment in a conventional transmission electron microscope.

S. Frabboni; G. C. Gazzadi; G. Pozzi

2007-01-01T23:59:59.000Z

184

On simulating 3D fluorescent microscope images  

Science Journals Connector (OSTI)

In recent years many various biomedical image segmentation methods have appeared. Though typically presented to be successful the majority of them was not properly tested against ground truth images. The obvious way of testing the quality of new segmentation ... Keywords: convolution, fluorescent optical microscope, procedural texture, simulator, synthetic image

David Svoboda; Marek Kašík; Martin Maška; Jan Hubeny; Stanislav Stejskal; Michal Zimmermann

2007-08-01T23:59:59.000Z

185

Le microscope des mathmaticiens Tribune du Net  

E-Print Network [OSTI]

cette "tribune" Interactif ! Deux parties : 1 les TIC du chercheur TIC = Technologies de l'Information et de la Communication #12;Contenu de cette "tribune" Interactif ! Deux parties : 1 les TIC du chercheur TIC = Technologies de l'Information et de la Communication 2 ordinateur : le microscope des

Theyssier, Guillaume

186

SLAC All Access: X-ray Microscope  

ScienceCinema (OSTI)

SLAC physicists Johanna Nelson and Yijin Liu give a brief overview of the X-ray microscope at the Stanford Synchrotron Radiation Lightsource (SSRL) that is helping improve rechargeable-battery technology by letting researchers peek into the inner workings of batteries as they operate.

Nelson, Johanna; Liu, Yijin

2014-06-13T23:59:59.000Z

187

On the Microscopic Origin of Cholesteric Pitch  

E-Print Network [OSTI]

We present a microscopic analysis of the instability of the nematic phase to chirality when molecular chirality is introduced perturbatively. We show that previously neglected short-range biaxial correlations play a crucial role in determining the cholesteric pitch. We propose an order parameter which quantifies the chirality of a molecule.

A. B. Harris; Randall D. Kamien; T. C. Lubensky

1996-07-11T23:59:59.000Z

188

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

3000F High Resolution Transmission Electron Microscope 3000F High Resolution Transmission Electron Microscope JEOL 3000F High Resolution Transmission Electron Microscope This is a high-resolution TEM equipped with an electron energy-loss spectrometer and a CCD camera for digital image acquisition. This microscope is used primarily for imaging the atomic structure of defects and interfaces in materials. Field emission electron source. Coherent source with an energy spread of 0.8 eV. Operation at accelerating voltages of up to 300 kV. +/- 10° of eucentric specimen tilt. Point to point resolution of 0.17 nm; 0.10 nm resolution can be extracted by computer processing. Gatan Multiscan CCD Camera for digital image acquisition. Automated microscope alignment: defocus calibration/adjustment, astigmatism correction and beam-tilt correction (automatic coma-free alignment).

189

Faculty Position in Materials Electron Microscopy  

E-Print Network [OSTI]

Faculty Position in Materials Electron Microscopy at the Ecole Polytechnique Fédérale de Lausanne in electron microscopy of materials within its Institute of Materials. We seek exceptional individuals who community. Top-level applications are invited from candidates at the cutting edge of electron microscopic

Candea, George

190

A review of the NRL CARS microscope  

Science Journals Connector (OSTI)

This paper describes a technique that permits molecular specificity in microscopy while retaining good spatial resolution. Specificity is achieved using Raman scattering from characteristic molecular vibrations and high resolution is obtained by imaging the distribution of visible anti?Stokes radiation. Images have been obtained from a variety of pure organic liquids from deuterated water in onion?skin cells deuterated liposomes and other samples. Thermal and dielectric breakdown damage to even fragile biological materials is made negligible by choice of duty cycle and average power. Sample fluorescence is avoided by the choice of anti?Stokes imaging. Imaging through (usually astigmatic) spectrometers is not needed. Deuterium substitution can be used as a general purpose and artifact?free ‘‘stain’’. The combination of high spatial resolution excellent molecular discrimination and digital image processing (background subtraction) provide the CARS microscope with capabilities not found in any other current microscopic imaging technique.

M. D. Duncan; J. Reintjes; T. J. Manuccia

1987-01-01T23:59:59.000Z

191

Dynamic study of tunable stiffness scanning microscope probe  

E-Print Network [OSTI]

This study examines the dynamic characteristics of the in-plane tunable stiffness scanning microscope probe for an atomic force microscope (AFM). The analysis was carried out using finite element analysis (FEA) methods for ...

Vega González, Myraida Angélica

2005-01-01T23:59:59.000Z

192

Interaction of electrons with light metal hydrides in the transmission electron microscope  

Science Journals Connector (OSTI)

......light elements are partially subject to this limitation. To achieve a high hydrogen capacity (see http://energy.gov/eere/fuelcells/hydrogen-storage and http://www.nedo.go.jp/activities/FF_00518.html ), the majority of currently......

Yongming Wang; Takenobu Wakasugi; Shigehito Isobe; Naoyuki Hashimoto; Somei Ohnuki

2014-10-01T23:59:59.000Z

193

Scanning tip microwave near field microscope  

DOE Patents [OSTI]

A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

Xiang, Xiao-Dong (Alameda, CA); Schultz, Peter G. (Oakland, CA); Wei, Tao (Albany, CA)

1998-01-01T23:59:59.000Z

194

Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope  

E-Print Network [OSTI]

We use a scanning tunneling microscope to probe single-electron charging phenomena in individual CdSe/ZnS (core/shell) quantum dots (QDs) at room temperature. The QDs are deposited on top of a bare Au thin film and form a ...

Bulovic, Vladimir

195

Scanning tunneling microscope tip as a positionable contact: Probing a Josephson-junction array at subkelvin temperatures  

E-Print Network [OSTI]

Scanning tunneling microscope tip as a positionable contact: Probing a Josephson-junction arrayK. The STM enables us to probe the structure, a Josephson-junction array, at various positions. Examples of such systems are two- dimensional electron gases and Josephson junction arrays.1

196

Microscopic model of critical current noise in Josephson-junction qubits: Subgap resonances and Andreev bound states  

E-Print Network [OSTI]

Microscopic model of critical current noise in Josephson-junction qubits: Subgap resonances in Josephson junctions based on individual trapping centers in the tunnel-barrier hybridized with electrons microresonators observed in Josephson-junction qubits R. W. Simmonds et al., Phys. Rev. Lett. 93, 077003 2004

von Delft, Jan

197

Development of a combined interference microscope objective and scanning probe microscope  

Science Journals Connector (OSTI)

A compact sensor head combining optical interference and scanning probe microscopy in a single instrument has been developed. This instrument is able to perform complementary quantitative measurements combining fast nondestructive three-dimensional surface analysis with high lateral resolution imaging. A custom interference microscopesensor head has been designed as the optical microscope objective and integrated within the architecture of a commercial interference microscope. The combined instrument makes available both the acquisition software and the hardware interface of the commercial microscope. The latter is able to function as a phase-shift interferometer or white light interferometer. Furthermore the use of an optical fiber to transmit light from an external laser: (i) removes a major heat source from the measurement environment and (ii) makes aperture correction unnecessary. The lateral resolution of the instrument has been extended by the addition of a previously developed compact scanning probe microscope(SPM) module to the custom interference microscope objective. This SPM unit is based upon piezoresistive cantilever technology. The “piezolevers” are self-sensing and therefore require no additional systems such as optical beam deflection or fiber interferometry to monitor their displacement. The mechanical simplicity of the piezolever SPM unit allows for a small physical size and can thus be added to the custom optical sensor head without violating constraints on the working distance defined by the optics. A major benefit of the system in terms of a quantitative nanometrology is the possibility to perform a traceable and direct calibration of the SPM module. This calibration is achieved practically by measuring an appropriate sample at a common location using both techniques. Results are presented here for the measurement of two calibration standards and a test sample to demonstrate the increased lateral resolution of the instrument.

James W. G. Tyrrell; Claudio Dal Savio; Rolf Krüger-Sehm; Hans-Ulrich Danzebrink

2004-01-01T23:59:59.000Z

198

Development of the doppler electron velocimeter: theory.  

SciTech Connect (OSTI)

Measurement of dynamic events at the nano-scale is currently impossible. This paper presents the theoretical underpinnings of a method for making these measurements using electron microscopes. Building on the work of Moellenstedt and Lichte who demonstrated Doppler shifting of an electron beam with a moving electron mirror, further work is proposed to perfect and utilize this concept in dynamic measurements. Specifically, using the concept of ''fringe-counting'' with the current principles of transmission electron holography, an extension of these methods to dynamic measurements is proposed. A presentation of the theory of Doppler electron wave shifting is given, starting from the development of the de Broglie wave, up through the equations describing interference effects and Doppler shifting in electron waves. A mathematical demonstration that Doppler shifting is identical to the conceptually easier to understand idea of counting moving fringes is given by analogy to optical interferometry. Finally, potential developmental experiments and uses of a Doppler electron microscope are discussed.

Reu, Phillip L.

2007-03-01T23:59:59.000Z

199

Spatial resolution limits in electron-beam-induced deposition N. Silvis-Cividjian, C. W. Hagen,a  

E-Print Network [OSTI]

were written in a 200-kV STEM on a 30-nm SiN membrane. © 2005 American Institute of Physics. DOI: 10-beam instruments, such as scanning electron microscopes, scanning transmission electron microscopes STEM of a singular deposited dot or line, always exceeds the diameter of the electron beam. Until recently, no one

Silvis-Cividjian, Natalia

200

Long working distance incoherent interference microscope  

DOE Patents [OSTI]

A full-field imaging, long working distance, incoherent interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. A long working distance greater than 10 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-dimensional height profiles of MEMS test structures to be acquired across an entire wafer while being actively probed, and, optionally, through a transparent window. An optically identical pair of sample and reference arm objectives is not required, which reduces the overall system cost, and also the cost and time required to change sample magnifications. Using a LED source, high magnification (e.g., 50.times.) can be obtained having excellent image quality, straight fringes, and high fringe contrast.

Sinclair, Michael B. (Albuquerque, NM); De Boer, Maarten P. (Albuquerque, NM)

2006-04-25T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


201

Three-dimensional scanning confocal laser microscope  

DOE Patents [OSTI]

A confocal microscope for generating an image of a sample includes a first scanning element for scanning a light beam along a first axis, and a second scanning element for scanning the light beam at a predetermined amplitude along a second axis perpendicular to the first axis. A third scanning element scans the light beam at a predetermined amplitude along a third axis perpendicular to an imaging plane defined by the first and second axes. The second and third scanning element are synchronized to scan at the same frequency. The second and third predetermined amplitudes are percentages of their maximum amplitudes. A selector determines the second and third predetermined amplitudes such that the sum of the percentages is equal to one-hundred percent.

Anderson, R. Rox (Lexington, MA); Webb, Robert H. (Lincoln, MA); Rajadhyaksha, Milind (Charlestown, MA)

1999-01-01T23:59:59.000Z

202

Microscopic study of Ca$+$Ca fusion  

E-Print Network [OSTI]

We investigate the fusion barriers for reactions involving Ca isotopes $\\mathrm{^{40}Ca}+\\mathrm{^{40}Ca}$, $\\mathrm{^{40}Ca}+\\mathrm{^{48}Ca}$, and $\\mathrm{^{48}Ca}+\\mathrm{^{48}Ca}$ using the microscopic time-dependent Hartree-Fock theory coupled with a density constraint. In this formalism the fusion barriers are directly obtained from TDHF dynamics. We also study the excitation of the pre-equilibrium GDR for the $\\mathrm{^{40}Ca}+\\mathrm{^{48}Ca}$ system and the associated $\\gamma$-ray emission spectrum. Fusion cross-sections are calculated using the incoming-wave boundary condition approach. We examine the dependence of fusion barriers on collision energy as well as on the different parametrizations of the Skyrme interaction.

R. Keser; A. S. Umar; V. E. Oberacker

2012-02-17T23:59:59.000Z

203

Single Atom Electron and Ion Sources and Their Applications  

E-Print Network [OSTI]

- energy electron point projection microscope, PPM) (37, 38) 1. (shadow microscopy) (shadow image-walled carbon nanotubes, SWNTs) (111) (pizeo-scanner) X- Y-Z (scanning tunneling microscope) 3. (a on the screen (mm) Intensity(Arb.Units) (c) (a) (b) Q FWHM P (a) (b)Dd sample holder detector-MCP #12;13 98

204

Generalized drift-diffusion for microscopic thermoelectricity  

E-Print Network [OSTI]

Although thermoelectric elements increasingly incorporate nano-scale features in similar material systems as other micro-electronic devices, the former are described in the language of irreversible thermodynamics while ...

Santhanam, Parthiban

2009-01-01T23:59:59.000Z

205

In situ electron microscopy study of growth of WO3 and MoO3 nanowhiskers  

Science Journals Connector (OSTI)

WO3 and MoO3 nanowhiskers were grown from nanosize WO3 and MoO3 powders intensely irradiated with electrons in an electron microscope. Solid and hollow nanowhiskers of these materials were observed. A growth mech...

1 R. T. Malkhasyan; R. K. Karakhanyan; M. N. Nazaryan…

2003-05-01T23:59:59.000Z

206

On the microscopic origin of light scattering in tissue  

Science Journals Connector (OSTI)

Understanding the nature of light scattering within tissue is a crucial issue for development of medical imaging techniques. Microscopic measurements of static light-scattering...

Kaplan, Peter; Weissman, Jesse; Hancewicz, Tom; Popp, Alois; Weitz, David

207

A Low-Cost Reflectance FT-IR Microscope  

Science Journals Connector (OSTI)

A Fourier transform infrared spectroscopy (FT-IR) microscope combines microscopy with infrared (IR) spectroscopic molecular characterization. IR microspectroscopy presents a...

Jansen, J A J; Van Der Maas, J H; Posthuma De Boer, A

1991-01-01T23:59:59.000Z

208

Microscopic Reactive Diffusion of Uranium in the Contaminated...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

States. Abstract: Microscopic and spectroscopic analysis of uranium-contaminated sediment cores beneath the BX waste tank farm at the US Department of Energy (DOE) Hanford...

209

A New Interpretation of the Scanning Tunneling Microscope Image...  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

of Graphite. A New Interpretation of the Scanning Tunneling Microscope Image of Graphite. Abstract: In this work, highly-resolved scanning tunneling microscopy images of graphite...

210

Development of a circularly polarizing microscope with a polarizing undulator  

Science Journals Connector (OSTI)

A circularly polarizing microscope by which we intend to obtain images with CD (circular dichroism) or CIDS (circular intensity differential scattering) in order to observe the structure and distribution of biomolecules has been constructed by using a polarizing undulator as the polarizing light source. The polarizing undulator with crossed and retarded magnetic field having fifteen periods was installed in the electron storage ring NIJI?II in the Electrotechnical Laboratory. A Schwarzschild?type mirror system combined with a convex mirror was developed in order to focus the undulator radiation to a microbeam keeping the quality of polarization of the radiation from the undulator. The beam size was from 0.66 ?m (at wavelength 200 nm) to 0.96 ?m (at 400 nm). Using a scanning sample stage and a photomultiplier which was positioned in the back of the sample some images with transmitted and scattered light from fibrous DNA have been obtained. Attempts have also been made at obtaining images with CD and CIDS from the alternation between right? and left?handed circularly polarized radiation from the undulator.

Toru Yamada; Masatada Yuri; Hideo Onuki; Shozo Ishizaka

1995-01-01T23:59:59.000Z

211

Electron Holography of Magnetic Nanostructures M.R. McCartney, R.E. Dunin-Borkowski, and D.J. Smith  

E-Print Network [OSTI]

.J. Smith Electron holography is an electron microscope imaging technique that permits quan- titative and sensitivity using electron holography. The #12;88 M.R. McCartney, R.E. Dunin-Borkowski, and D.J. Smith

Dunin-Borkowski, Rafal E.

212

Los Alamos: MST-MTM: EML: Electron Microscopy Laboratory  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Microscopy Laboratory, MST-6 Electron Microscopy Laboratory, MST-6 MST-6 Home Home In the MSL FEI Tecnai F30 Analytical TEM/STEM JEOL 6300FXV High Resolution SEM JEOL 3000F High Resolution Transmission Electron Microscope Philips XL30 F Scanning Electron Microscope & Orientation Imaging System Phillips CM30 Transmission Electron Microscope In the Sigma Building JEOL 840 EPMA with Wavelength Dispersive Spectroscopy FEI Strata DB235 FIB/SEM FEI XL30 Environmental Scanning Electron Microscope & Orientation Imaging System CONTACTS Bob Field 665.3938 Pat Dickerson 665.3036 Rob Dickerson 667.6337 Rod McCabe 606.1649 The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory's Capabilities The Electron Microscopy Laboratory (EML) is part of MST-6, the Materials Technology - Metallurgy Group within the Materials Science and Technology Division at Los Alamos National Laboratory. It is a facility dedicated to the characterization of materials primarily through imaging, chemical, and crystallographic analyses of material microstructures with several electron and ion beam instruments. Accessory characterization techniques and equipment include energy dispersive x-ray analysis (EDS), wavelength dispersive x-ray analysis (WDS), electron backscatter diffraction (EBSD) and orientation imaging microscopy (OIM), and electron energy loss spectroscopy (EELS).

213

Visual Positioning of Previously Defined ROIs on Microscopic Slides  

E-Print Network [OSTI]

1 Visual Positioning of Previously Defined ROIs on Microscopic Slides Grigory Begelman, Michael slide area. Various microscopy related medical applications, such as telepathology and computer aided of interest. In this paper we present a method for image-based auto positioning on a microscope slide

Rivlin, Ehud

214

Sample mounting and transfer for coupling an ultrahigh vacuum variable temperature beetle scanning tunneling microscope with conventional surface probes  

SciTech Connect (OSTI)

We present a new ultrahigh vacuum (UHV) chamber for surface analysis and microscopy at controlled, variable temperatures. The new instrument allows surface analysis with Auger electron spectroscopy, low energy electron diffraction, quadrupole mass spectrometer, argon ion sputtering gun, and a variable temperature scanning tunneling microscope (VT-STM). In this system, we introduce a novel procedure for transferring a sample off a conventional UHV manipulator and onto a scanning tunneling microscope in the conventional ''beetle'' geometry, without disconnecting the heating or thermocouple wires. The microscope, a modified version of the Besocke beetle microscope, is mounted on a 2.75 in. outer diameter UHV flange and is directly attached to the base of the chamber. The sample is attached to a tripod sample holder that is held by the main manipulator. Under UHV conditions the tripod sample holder can be removed from the main manipulator and placed onto the STM. The VT-STM has the capability of acquiring images between the temperature range of 180--500 K. The performance of the chamber is demonstrated here by producing an ordered array of island vacancy defects on a Pt(111) surface and obtaining STM images of these defects.

Nafisi, Kourosh; Ranau, Werner; Hemminger, John C.

2001-01-01T23:59:59.000Z

215

A soft-X-ray imaging microscope with multilayer-coated Schwarzschild optics  

Science Journals Connector (OSTI)

We constructed a soft-X-ray imaging microscope based on a multilayer-coated Schwarzschild objective. The Schwarzschild objective was designed to have a 50 x magnification and a numerical aperture of 0.25. The mirrors of the objective were coated with a Mo/Si multilayer to reflect the Si L emission. The overall throughput of the objective was 14% at a peak wavelength of 13.3 nm. The 5-?m wide stripe of SiO 2 lithographically patterned was observed under irradiation with an electron beam of 1 ?A.

M. Toyoda; Y. Shitani; M. Yanagihara; T. Ejima; M. Yamamoto; M. Watanabe

2000-01-01T23:59:59.000Z

216

MIAMI: Microscope and ion accelerator for materials investigations  

SciTech Connect (OSTI)

A transmission electron microscope (TEM) with in situ ion irradiation has been built at the University of Salford, U.K. The system consists of a Colutron G-2 ion source connected to a JEOL JEM-2000FX TEM via an in-house designed and constructed ion beam transport system. The ion source can deliver ion energies from 0.5 to 10 keV for singly charged ions and can be floated up to 100 kV to allow acceleration to higher energies. Ion species from H to Xe can be produced for the full range of energies allowing the investigation of implantation with light ions such as helium as well as the effects of displacing irradiation with heavy inert or self-ions. The ability to implant light ions at energies low enough such that they come to rest within the thickness of a TEM sample and to also irradiate with heavier species at energies sufficient to cause large numbers of atomic displacements makes this facility ideally suited to the study of materials for use in nuclear environments. TEM allows the internal microstructure of a sample to be imaged at the nanoscale. By irradiating in situ it is possible to observe the dynamic evolution of radiation damage which can occur during irradiation as a result of competing processes within the system being studied. Furthermore, experimental variables such as temperature can be controlled and maintained throughout both irradiation and observation. This combination of capabilities enables an understanding of the underlying atomistic processes to be gained and thus gives invaluable insights into the fundamental physics governing the response of materials to irradiation. Details of the design and specifications of the MIAMI facility are given along with examples of initial experimental results in silicon and silicon carbide.

Hinks, J. A.; Berg, J. A. van den; Donnelly, S. E. [Centre for Materials and Physics, University of Salford, The Crescent, Salford, Greater Manchester M5 4WT (United Kingdom)

2011-03-15T23:59:59.000Z

217

Beam damage suppression of low- porous Si–O–C films by cryo-electron-energy loss spectroscopy (EELS)  

Science Journals Connector (OSTI)

......plasma processes studied by energy filtered and analytical...Egerton R F . Electron Energy Loss Spectroscopy in the...Microscope (1996) 2nd edn. New York: Plenum. 277-288...Transmission Electron Energy Loss spectrometry in Materials......

Yuji Otsuka; Yumiko Shimizu; Isao Tanaka

2009-04-01T23:59:59.000Z

218

Optical system for high-speed Atomic Force Microscope  

E-Print Network [OSTI]

This thesis presents the design and development of an optical cantilever deflection sensor for a high speed Atomic Force Microscope (AFM). This optical sensing system is able to track a small cantilever while the X-Y scanner ...

Lim, Kwang Yong, S.M. Massachusetts Institute of Technology

2010-01-01T23:59:59.000Z

219

Department of Mechanical Engineering "Heat Under the Microscope  

E-Print Network [OSTI]

applications ranging from thermoelectric waste heat recovery to radio astronomy. BIOGRAPHY Austin MinnichDepartment of Mechanical Engineering presents "Heat Under the Microscope: Uncovering an essential role in nearly every technological application, ranging from space power generation to consumer

Militzer, Burkhard

220

Lensless digital holographic microscope with light-emitting diode illumination  

Science Journals Connector (OSTI)

We demonstrate the operation of a digital in-line microscope with LED illumination. We show with a practical example that, for typical setups, the limited temporal coherence and the...

Repetto, L; Piano, E; Pontiggia, C

2004-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


221

Design and analysis of a monolithic flexure atomic force microscope  

E-Print Network [OSTI]

This thesis details the design, manufacture, and testing of a sub-nanometer accuracy atomic force microscope. It was made to be integrated into the Sub-Atomic Measuring Machine (SAMM) in collaboration with the University ...

Ljubicic, Dean M

2008-01-01T23:59:59.000Z

222

Development of a Schwarzschild-type x-ray microscope  

Science Journals Connector (OSTI)

A Schwarzschild-type x-ray microscope has been designed, constructed, and tested. Ni/C multilayers were used as the x-ray mirrors, with a thickness (2d) of 7 nm and 30 layer pairs. The...

Kado, M; Yamashita, K; Ohtani, M; Tanaka, K A; Kodama, R; Kitamoto, S; Yamanaka, T; Nakai, S

1991-01-01T23:59:59.000Z

223

Microscopic observations of samples affected by delayed ettringite formation (DEF)  

Science Journals Connector (OSTI)

This article, which deals with the study of the microscopic modifications of DEF-affected materials, has two main objectives. The first one is to study the influence of sample preparation on the microcracks of sp...

Nordine Leklou; Jean-Emmanuel Aubert; Gilles Escadeillas

2009-12-01T23:59:59.000Z

224

Construction of an ultra-low temperature scanning tunneling microscope  

Science Journals Connector (OSTI)

We describe designs and specifications of an ultra-low temperature scanning tunneling microscope developed at ... works over a wide temperature range between 90 mK and 300 K with atomic resolution as...

Hiroshi Fukuyama; Hiroki Tan; Tetsuya Handa…

1996-01-01T23:59:59.000Z

225

Imaging of quantum Hall edge states under quasiresonant excitation by a near-field scanning optical microscope  

SciTech Connect (OSTI)

A high resolution mapping of quantum Hall edge states has been performed by locally creating electrons with small excess energies with a near-field scanning optical microscope in a dilution refrigerator. We have observed fine structures parallel to the edge in photovoltage signals, which appear only at low temperature. The observed fine structures near sample edges have been seen to shift inward with increase in magnetic field in accordance with Chklovskii Shklovskii, and Glazman model.

Ito, H.; Shibata, Y.; Mamyoda, S.; Ootuka, Y.; Nomura, S. [Division of Physics, University of Tsukuba, Tennodai, Tsukuba, 305-8571 (Japan); Kashiwaya, S. [National Institute of Advanced Industrial Science and Technology (AIST), Umezono, Tsukuba, 305-8568 (Japan); Yamaguchi, M.; Akazaki, T.; Tamura, H. [NTT Basic Research Laboratories, NTT Corporation, Morinosato-Wakamiya, Atsugi, 243-0198 (Japan)

2013-12-04T23:59:59.000Z

226

A CCD Camera with Electron Decelerator for Intermediate Voltage Electron Microscopy  

SciTech Connect (OSTI)

Electron microscopists are increasingly turning to Intermediate Voltage Electron Microscopes (IVEMs) operating at 300 - 400 kV for a wide range of studies. They are also increasingly taking advantage of slow-scan charge coupled device (CCD) cameras, which have become widely used on electron microscopes. Under some conditions CCDs provide an improvement in data quality over photographic film, as well as the many advantages of direct digital readout. However, CCD performance is seriously degraded on IVEMs compared to the more conventional 100 kV microscopes. In order to increase the efficiency and quality of data recording on IVEMs, we have developed a CCD camera system in which the electrons are decelerated to below 100 kV before impacting the camera, resulting in greatly improved performance in both signal quality and resolution compared to other CCDs used in electron microscopy. These improvements will allow high-quality image and diffraction data to be collected directly with the CCD, enabling improvements in data collection for applications including high-resolution electron crystallography, single-particle reconstruction of protein structures, tomographic studies of cell ultrastructure and remote microscope operation. This approach will enable us to use even larger format CCD chips that are being developed with smaller pixels.

Downing, Kenneth H; Downing, Kenneth H.; Mooney, Paul E.

2008-03-17T23:59:59.000Z

227

Soft x-ray laser microscope. Final report  

SciTech Connect (OSTI)

The program consisted of two phases (Phase I and Phase II). The goal of the Phase I (first year program) was to design and construct the Soft X-ray Laser Contact Microscope. Such microscope was constructed and adapted to PPL`s 18.2nm soft X-ray Laser (SXL), which in turn was modified and prepared for microscopy experiments. Investigation of the photoresist response to 18.2nm laser radiation and transmissivity of 0.1m thick silicion-nitride (Si{sub 3}N{sub 4}) windows were important initial works. The goal of the first year of Phase II was to construct X-ray contact microscope in combination with existing optical phase microscope, already used by biologists. In the second year of Phase II study of dehydrated Horeseshoe Crab and Hela cancer cells were performed with COXRALM. Also during Phase II, the Imaging X-Ray Laser Microscope (IXRALM) was designed and constructed. This paper describes the development of each of the microscopes and their application for research.

Suckewer, P.I.

1990-10-01T23:59:59.000Z

228

MODIFYING AN INVERTED LABORATORY MICROSCOPE FOR RAMAN Presented in Partial Fulfillment of the Requirements for  

E-Print Network [OSTI]

MODIFYING AN INVERTED LABORATORY MICROSCOPE FOR RAMAN MICROSCOPY A Thesis Presented in Partial modifications a spectroscopic imaging instrument, a Raman microscope, can be constructed from a common inverted

229

Polarization-preserving confocal microscope for optical experiments in a dilution refrigerator with high magnetic field  

E-Print Network [OSTI]

We present the design and operation of a fiber-based cryogenic confocal microscope. It is designed as a compact cold-finger that fits inside the bore of a superconducting magnet, and which is a modular unit that can be easily swapped between use in a dilution refrigerator and other cryostats. We aimed at application in quantum optical experiments with electron spins in semiconductors and the design has been optimized for driving with, and detection of optical fields with well-defined polarizations. This was implemented with optical access via a polarization maintaining fiber together with Voigt geometry at the cold finger, which circumvents Faraday rotations in the optical components in high magnetic fields. Our unit is versatile for use in experiments that measure photoluminescence, reflection, or transmission, as we demonstrate with a quantum optical experiment with an ensemble of donor-bound electrons in a thin GaAs film.

Maksym Sladkov; M. P. Bakker; A. U. Chaubal; D. Reuter; A. D. Wieck; C. H. van der Wal

2010-10-09T23:59:59.000Z

230

Polarization-preserving confocal microscope for optical experiments in a dilution refrigerator with high magnetic field  

E-Print Network [OSTI]

We present the design and operation of a fiber-based cryogenic confocal microscope. It is designed as a compact cold-finger that fits inside the bore of a superconducting magnet, and which is a modular unit that can be easily swapped between use in a dilution refrigerator and other cryostats. We aimed at application in quantum optical experiments with electron spins in semiconductors and the design has been optimized for driving with, and detection of optical fields with well-defined polarizations. This was implemented with optical access via a polarization maintaining fiber together with Voigt geometry at the cold finger, which circumvents Faraday rotations in the optical components in high magnetic fields. Our unit is versatile for use in experiments that measure photoluminescence, reflection, or transmission, as we demonstrate with a quantum optical experiment with an ensemble of donor-bound electrons in a thin GaAs film.

Sladkov, Maksym; Chaubal, A U; Reuter, D; Wieck, A D; van der Wal, C H

2010-01-01T23:59:59.000Z

231

Polarization-preserving confocal microscope for optical experiments in a dilution refrigerator with high magnetic field  

Science Journals Connector (OSTI)

We present the design and operation of a fiber-based cryogenic confocal microscope. It is designed as a compact cold-finger that fits inside the bore of a superconducting magnet and which is a modular unit that can be easily swapped between use in a dilution refrigerator and other cryostats. We aimed at application in quantum optical experiments with electron spins in semiconductors and the design has been optimized for driving with and detection of optical fields with well-defined polarizations. This was implemented with optical access via a polarization maintaining fiber together with Voigt geometry at the cold finger which circumvents Faraday rotations in the optical components in high magnetic fields. Our unit is versatile for use in experiments that measure photoluminescence reflection or transmission as we demonstrate with a quantum optical experiment with an ensemble of donor-bound electrons in a thin GaAs film.

Maksym Sladkov; M. P. Bakker; A. U. Chaubal; D. Reuter; A. D. Wieck; C. H. van der Wal

2011-01-01T23:59:59.000Z

232

QUANTITATIVE ELECTRON HOLOGRAPHY OF BIASED SEMICONDUCTOR DEVICES  

E-Print Network [OSTI]

ion beam (FIB) milling (Fig. 1b). Figure 2a shows a 200 kV holographic phase image obtained from transmission electron microscope (FEGTEM)2 . The technique relies on the use of an electrostatic biprism (eg to result from the presence of an electrically dead layer that runs around its entire surface. A line trace

Dunin-Borkowski, Rafal E.

233

Vibration-Assisted Electron Tunneling in C140 Transistors  

Science Journals Connector (OSTI)

Vibration-Assisted Electron Tunneling in C140 Transistors ... When electrons travel through molecules, vibrational modes of the molecules can affect current flow. ... 1 Recently, effects of vibrations in single molecules have been measured using scanning tunneling microscopes,2 single-molecule transistors,3,4 and mechanical break junctions. ...

A. N. Pasupathy; J. Park; C. Chang; A. V. Soldatov; S. Lebedkin; R. C. Bialczak; J. E. Grose; L. A. K. Donev; J. P. Sethna; D. C. Ralph; P. L. McEuen

2005-01-07T23:59:59.000Z

234

A new scanning photoemission microscope for ELETTRA: SuperMAXIMUM  

Science Journals Connector (OSTI)

High brightness third?generation synchrotrons allow diffraction?limited performance and large flux for scanning photoemission microscopes. A new microscope SuperMAXIMUM is being developed at the University of Wisconsin Center for X ray Lithography in collaboration with the Sincrotrone Trieste. The beamline being built in Trieste uses a variable angle spherical gratingmonochromator (VASGM). A combination of rotation of a plane mirror and rotation of the spherical grating keeps the slit positions and beam directions fixed. The microscope objectives are normal?incidence multilayer?coated Schwarzschild objectives. The project which is nearing completion utilizes novel designs for optics alignment sample rastering mechanics and software control. We will discuss the project status new designs and techniques.

John T. Welnak; H. Solak; J. Wallace; F. Cerrina; F. Barbo; M. Bertolo; A. Bianco; S. Di Fonzo; S. Fontana; W. Jark; F. Mazzolini; R. Rosei; A. Savoia; J.H. Underwood; G. Margaritondo

1996-01-01T23:59:59.000Z

235

A new scanning photoemission microscope for ELETTRA: SuperMAXIMUM  

SciTech Connect (OSTI)

High brightness, third-generation synchrotrons allow diffraction-limited performance and large flux for scanning photoemission microscopes. A new microscope, SuperMAXIMUM, is being developed at the University of Wisconsin Center for X ray Lithography in collaboration with the Sincrotrone Trieste. The beamline, being built in Trieste, uses a variable angle spherical grating monochromator (VASGM). A combination of rotation of a plane mirror and rotation of the spherical grating keeps the slit positions and beam directions fixed. The microscope objectives are normal-incidence, multilayer-coated Schwarzschild objectives. The project, which is nearing completion, utilizes novel designs for optics alignment, sample rastering mechanics, and software control. We will discuss the project status, new designs, and techniques. {copyright} {ital 1996 American Institute of Physics.}

Welnak, J.T.; Solak, H.; Wallace, J.; Cerrina, F.; Barbo, F.; Bertolo, M.; Bianco, A.; Di Fonzo, S.; Fontana, S.; Jark, W.; Mazzolini, F.; Rosei, R.; Savoia, A.; Underwood, J.; Margaritondo, G. [University of WI--Center for X ray Lithography, 3731 Schneider Drive, Stoughton, WI 53589 (United States)] [University of WI--Center for X ray Lithography, 3731 Schneider Drive, Stoughton, WI 53589 (United States); [Sincrotrone Trieste, Padriciano 99, 34012, Trieste (Italy); [Lawrence Berkeley Laboratory, Center for X ray Optics, 1 Cyclotron Road, 80-101, Berkeley, CA 94720 (United States); [Institut de Physique Appliqee, Ecole Polytechnique Federale, CH-1015, Lausanne (Switzerland)

1996-09-01T23:59:59.000Z

236

Spectro-Microscopic Measurements of Carbonaceous Aerosol Aging in Central California  

SciTech Connect (OSTI)

Carbonaceous aerosols are responsible for large uncertainties in climate models, degraded visibility, and adverse health effects. The Carbonaceous Aerosols and Radiative Effects Study (CARES) was designed to study carbonaceous aerosols in the natural environment of Central Valley, California, and learn more about their atmospheric formation and aging. This paper presents results from spectro-microscopic measurements of carbonaceous particles collected during CARES at the time of pollution accumulation event (June 27-29, 2010), when in situ measurements indicated an increase in the organic carbon content of aerosols as the Sacramento urban plume aged. Computer controlled scanning electron microscopy coupled with an energy dispersive X-ray detector (CCSEM/EDX) and scanning transmission X-ray microscopy coupled with near edge X-ray absorption spectroscopy (STXM/NEXAFS) were used to probe the chemical composition and morphology of individual particles. It was found that the mass of organic carbon on individual particles increased through condensation of secondary organic aerosol. STXM/NEXAFS indicated that the number fraction of homogenous organic particles lacking inorganic inclusions (greater than ~50 nm diameter) increased with plume age as did the organic mass per particle. Comparison of the CARES spectro-microscopic data set with a similar dataset obtained in Mexico City during the MILAGRO campaign showed that individual particles in Mexico City contained twice as much carbon as those sampled during CARES. The number fraction of soot particles at the Mexico City urban site (30%) was larger than at the CARES urban site (10%) and the most aged samples from CARES contained less carbon-carbon double bonds. Differences between carbonaceous particles in Mexico City and California result from different sources, photochemical conditions, gas phase reactants, and secondary organic aerosol precursors. The detailed results provided by these spectro-microscopic measurements will allow for a comprehensive evaluation of aerosol process models used in climate research.

Moffet, Ryan C.; Rodel, Tobias; Kelly, Stephen T.; Yu, Xiao-Ying; Carroll, Gregory; Fast, Jerome D.; Zaveri, Rahul A.; Laskin, Alexander; Gilles, Mary K.

2013-10-29T23:59:59.000Z

237

Reflection soft X-ray microscope and method  

DOE Patents [OSTI]

A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

Suckewer, Szymon (Princeton, NJ); Skinner, Charles H. (Lawrenceville, NJ); Rosser, Roy (Princeton, NJ)

1993-01-01T23:59:59.000Z

238

Mechanisms of Nickel Sorption on Pyrophyllite: Macroscopic and Microscopic Approaches  

E-Print Network [OSTI]

Mechanisms of Nickel Sorption on Pyrophyllite: Macroscopic and Microscopic Approaches Andre M of the sorption mechanisms of heavy metals on soil mineral surfaces is therefore of fundamental importance. This study examined Ni(Il) sorption mechanisms on pyrophyllite. The removal of Ni from solution was studied

Sparks, Donald L.

239

Neutrinoless double beta decay in the microscopic interacting boson model  

Science Journals Connector (OSTI)

The results of a calculation of the nuclear matrix elements for neutrinoless double beta decay in the closure approximation in several nuclei within the framework of the microscopic interacting boson model (IBM?2) are presented and compared with those calculated in the shell model (SM) and quasiparticle random phase approximation (QRPA).

F. Iachello

2009-01-01T23:59:59.000Z

240

Quantum microscopic approach to low-energy heavy ion collisions  

E-Print Network [OSTI]

of nuclear reactions at low energy where quantum effects play a significant role is an important challenge of nuclear physics. The interplay between nuclear structure and reaction mechanisms is crucial at energiesQuantum microscopic approach to low-energy heavy ion collisions C´edric Simenel1,2, Aditya Wakhle2

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


241

Microscopic characteristics of solid particles in opposed multi-burner gasifier  

Science Journals Connector (OSTI)

Abstract The microscopic characteristics of solid particles have important influence on the formation of fluid slag, coarse slag and fine slag during entrained-flow gasification process. Based on the bench-scale opposed multi-burner (OMB) gasifier, solid particles were sampled at different axial distances along the gasifier chamber under typical operating conditions (oxygen and carbon atomic ratio at 1.0). The microscopic characteristics of solid particles were studied by using N2 adsorption-desorption and scanning electron microscopy (SEM) methods. The results show that the solid particles are comprised mainly of porous irregular particle and spherical particle, and few solid particles generated at burner plane perform as dense irregular and hollow shape. As the gasification reaction proceeds along the axis of gasifier, the surface structure of particles becomes rougher, and the pore structure increases. The isotherms of particle samples are all type II, and the particle samples consist of continuous and complete system of pores. The hysteresis loops are H3-type, and there are a large amount of fractured pores. BET surface area and pore volume increase with increasing distance from the burner plane, and average pore diameter gradually reduces, and larger changes occur in the vicinity of the burner plane. The mesopores less than 10 nm vary apparently and increase with increasing distances from the burner plane, while the pores larger than 10 nm are almost unchanged.

Li-jun SUN; Yan GONG; Qing-hua GUO; Guang-suo YU

2014-01-01T23:59:59.000Z

242

Microscopic description of neutron emission rates in compound nuclei  

E-Print Network [OSTI]

The neutron emission rates in thermal excited nuclei are conventionally described by statistical models with a phenomenological level density parameter that depends on excitation energies, deformations and mass regions. In the microscopic view of hot nuclei, the neutron emission rates can be determined by the external neutron gas densities without any free parameters. Therefore the microscopic description of thermal neutron emissions is desirable that can impact several understandings such as survival probabilities of superheavy compound nuclei and neutron emissivity in reactors. To describe the neutron emission rates microscopically, the external thermal neutron gases are self-consistently obtained based on the Finite-Temperature Hartree-Fock-Bogoliubov (FT-HFB) approach. The results are compared with the statistical model to explore the connections between the FT-HFB approach and the statistical model. The Skyrme FT-HFB equation is solved by HFB-AX in deformed coordinate spaces. Based on the FT-HFB approach, the thermal properties and external neutron gas are properly described with the self-consistent gas substraction procedure. Then neutron emission rates can be obtained based on the densities of external neutron gases. The thermal statistical properties of $^{238}$U and $^{258}$U are studied in detail in terms of excitation energies. The thermal neutron emission rates in $^{238, 258}$U and superheavy compound nuclei $_{112}^{278}$Cn and $_{114}^{292}$Fl are calculated, which agree well with the statistical model by adopting an excitation-energy-dependent level density parameter. The coordinate-space FT-HFB approach can provide reliable microscopic descriptions of neutron emission rates in hot nuclei, as well as microscopic constraints on the excitation energy dependence of level density parameters for statistical models.

Yi Zhu; Junchen Pei

2014-11-02T23:59:59.000Z

243

Microscopic model, spin-wave theory, and competing orders in double perovskites  

Science Journals Connector (OSTI)

We present a microscopic theory of carrier-induced ferrimagnetism in metallic double perovskite compounds such as Sr2FeMoO6 and Sr2FeReO6 which have recently attracted intense interest for their possible applications to magnetotransport devices. The theory is based on an effective “Kondo-like” Hamiltonian treated here within the large-S expansion. We find that depending on the value of the carrier density the ground state is either a ferrimagnet or a layered antiferromagnet. The ferrimagnetic state has a robust half-metallic electronic structure. The transition to antiferromagnetic phase is first order, accompanied with the regime of phase separation. We study spin-wave spectrum including quantum corrections and find strongly enhanced quantum effects in the vicinity of zero-temperature phase transition.

G. Jackeli

2003-09-02T23:59:59.000Z

244

Ion-induced electron emission microscopy  

DOE Patents [OSTI]

An ion beam analysis system that creates multidimensional maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the secondary electrons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted secondary electrons are collected in a strong electric field perpendicular to the sample surface and (optionally) projected and refocused by the electron lenses found in a photon emission electron microscope, amplified by microchannel plates and then their exact position is sensed by a very sensitive X Y position detector. Position signals from this secondary electron detector are then correlated in time with nuclear, atomic or electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these secondary electrons in the fit place.

Doyle, Barney L. (Albuquerque, NM); Vizkelethy, Gyorgy (Albuquerque, NM); Weller, Robert A. (Brentwood, TN)

2001-01-01T23:59:59.000Z

245

Light and Electron Microscopic Studies of Microorganisms Growing in Rotating Biological Contactor Biofilms  

Science Journals Connector (OSTI)

...sufficient to operate the unit at a hydraulic loading rate of 0.04 m3...was housed in a laboratory trailer located at the Durham, N...continuously to achieve an overall hydraulic loading rate of 0.04 m3...the effects offluctuating hydraulic and organic load- ings in...

Nancy E. Kinner; David L. Balkwill; Paul L. Bishop

1983-05-01T23:59:59.000Z

246

The In situ Compression of Annealed Molybdenum Nanopillars in the Transmission Electron Microscope  

E-Print Network [OSTI]

lengths in finite samples. Scr. Mater. 56, 313-316 (2007).prismatic slip orientation. Scr. Mater. 65, 473-476, doi:using a new technique. Scr. Mater. 57, 397-400, doi:

Lowry, Matthew

2011-01-01T23:59:59.000Z

247

Electron Microscope Studies of Heteroduplex DNA from a Deletion Mutant of Bacteriophage ?X-174  

Science Journals Connector (OSTI)

...Accordingly, in Fig. 3 we depict the hetero- duplexes as having a nick in'the deleted strand.) Structure B can only occur for a...migration. Several points, however, are sufficiently clear to merit discussion. Since branch migration processes involve successive...

Jung-Suh Kim; Phillip A. Sharp; Norman Davidson

1972-01-01T23:59:59.000Z

248

Dynamic studies of catalysts for biofuel synthesis in an Environmental Transmission Electron Microscope  

E-Print Network [OSTI]

4. Institute for Microstructure Research, Research Centre Juelich, D-52425 Juelich, Germany ldld resources requires new and better production paths. One approach involves the use of biogas to synthesize

Dunin-Borkowski, Rafal E.

249

An Electron Microscopic Cytochemical Study on the Mechanism of Antibody Production in in vitro System  

Science Journals Connector (OSTI)

......the specific antibody production of P3-J (Jijoy...globulin.3 ^ The antibody production of this cell line is...cell line during the production of an antibody after...antigen. Materials and Methods Cell line. A human...Karnovsky's medium10 ^ without hydrogen peroxide at 4 C for......

Ikuo SUZUKI; Taijo TAKAHASHI

1972-01-01T23:59:59.000Z

250

The In situ Compression of Annealed Molybdenum Nanopillars in the Transmission Electron Microscope  

E-Print Network [OSTI]

records both load and deflection data as the compressiongathering both load and displacement data. Each of theseacquisition of both load and displacement data during a

Lowry, Matthew

2011-01-01T23:59:59.000Z

251

The In situ Compression of Annealed Molybdenum Nanopillars in the Transmission Electron Microscope  

E-Print Network [OSTI]

funded by the U.S. Department of Energy, Office of Science,Office of Basic Energy Sciences. The author also

Lowry, Matthew

2011-01-01T23:59:59.000Z

252

The In situ Compression of Annealed Molybdenum Nanopillars in the Transmission Electron Microscope  

E-Print Network [OSTI]

GPa; the load drop once again occurs following the escape ofload drop seen in the mechanical data (Fig. 4.25) at 2.40 GPa occurs immediately following

Lowry, Matthew

2011-01-01T23:59:59.000Z

253

Observation of the potential distribution in GaN-based devices by a scanning electron microscope  

Science Journals Connector (OSTI)

......potential. On the other hand, higher accelerating voltages resulted in blurred images. The second sample was a light emitting diode structure based on AlN where a multiple quantum well (MQW) structure was sandwiched by p- and n-AlGaN materials......

Takahiro Karumi; Shigeyasu Tanaka; Takayoshi Tanji

2014-11-01T23:59:59.000Z

254

Electron Microscopic Study of Osteoblasts and Their Matrix in Lathyritic Rats  

Science Journals Connector (OSTI)

......membrane pro- duction10 -16 >, lysosome formation511 -321 , car- bohydrate synthesis"-Z5) , and so on. NEUTBA and LEBLOND23...lathy- ritic tissue. While, others2 -z6) have proposed defective formation, excessive destruction and depolymerization of the......

Takaaki ENOMOTO

1969-01-01T23:59:59.000Z

255

CHEMICAL INDUCTION OF RUBBER BIOSYNTHESIS IN GUAYULE: AN ELECTRON MICROSCOPE STUDY  

E-Print Network [OSTI]

into the mechanism of rubber production and the nature andthe discovery of the rubber production enhancing effects ofrubber biosynthesis in guayule would appear to be the production

Bauer, Thomas

2011-01-01T23:59:59.000Z

256

Transmission electron microscope as an ultimate tool for nanomaterial property studies  

Science Journals Connector (OSTI)

......for proton exchange membrane fuel cells: multiarmed starlike...high-performance lithium ion batteries. Chem. Commun. (2011...High-performance lithium battery anodes using silicon nanowires...high-performance lithium ion batteries. Chem. Commun. (2011......

Naoyuki Kawamoto; Dai-Ming Tang; Xianlong Wei; Xi Wang; Masanori Mitome; Yoshio Bando; Dmitri Golberg

2013-02-01T23:59:59.000Z

257

Self-assembled nanoparticle surface patterning for improved digital image correlation in a scanning electron microscope  

E-Print Network [OSTI]

aluminum, as well as rolled aluminum and wire electric discharge machine (EDM) cut aluminum surfaces

Daly, Samantha

258

Technical report on the General Electric model #1 electrostatic electron microscope  

E-Print Network [OSTI]

results may be obtained. (&) The equation for spherical aberration is ds = CfP cm Eq. 5 where d is the diameter of the disc of confusion; 0 is 8 the d1mensionless constant due to spherical aberrations; f is the focal length; and p is the aperture.... Therefore ds -dd -8 Ctg a 10xl0 p~ 4 loxlo Cf ~ Eq. 7 f' or optimum resolution dopt = y'd + dd and since ds dd d t = 'i/2Cl dopt = ?' Z CfP substituting Eq. 7 d = 600(Cf) ~ V opt Eq. 8 Prom Eq. 8, it can be seen that if f is decreased and V 1...

Druce, Albert J

2012-06-07T23:59:59.000Z

259

Development of a nanostructure thermal property measurement platform compatible with a transmission electron microscope  

E-Print Network [OSTI]

Measurements of the electrical and thermal transport properties of one-dimensional nanostructures (e.g., nanotubes and nanowires) typically are obtained without detailed knowledge of the specimen's atomicscale structure ...

Harris, C. Thomas (Charles Thomas)

2010-01-01T23:59:59.000Z

260

Berkeley Lab A to Z Index: T  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Table of Isotopes Table of Isotopes Table of Isotopes: Exploring Taleo Tax Services Technology Transfer Opportunities and Approaches at the Lab Telecommuting Telemetry Database Telephone Service Center: Audio/Web Conferencing, Cellular, Rates, etc. Telephone Services: How To Request Telephone Service and Equipment Termination Termination Process Guide Termination Notification System (TNS) TeX, LaTeX Information Thermostats and Comfort Controls Time Reporting Today at Berkeley Lab To Know Ourselves: The U.S. Department of Energy and the Human Genome Project Total Rewards at Berkeley Lab Tours: Joint Genome Institution Educational Tours of Berkeley Lab for the Public Traffic Safety Training (EH&S) Training (OCFO) Training Resources Transit Passes TEAM (Transmission Electron Aberration-Corrected Microscope)

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


261

Atomic-scale chemical quantification of oxide interfaces using energy-dispersive X-ray spectroscopy  

SciTech Connect (OSTI)

Atomic-scale quantification of chemical composition across oxide interfaces is important for understanding physical properties of epitaxial oxide nanostructures. Energy-dispersive X-ray spectroscopy (EDS) in an aberration-corrected scanning transmission electron microscope was used to quantify chemical composition across the interface of ferromagnetic La{sub 0.7}Sr{sub 0.3}MnO{sub 3} and antiferromagnetic BiFeO{sub 3} quantum structure. This research demonstrates that chemical composition at atomic columns can be quantified by Gaussian peak-fitting of EDS compositional profiles across the interface. Cation diffusion was observed at both A- and B-sublattice sites; and asymmetric chemical profiles exist across the interface, consistent with the previous studies.

Lu, Ping; Van Benthem, Mark [Sandia National Laboratories, P.O. Box 5800, MS 1411, Albuquerque, New Mexico 87185-1411 (United States)] [Sandia National Laboratories, P.O. Box 5800, MS 1411, Albuquerque, New Mexico 87185-1411 (United States); Xiong, Jie; Jia, Quanxi [Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)] [Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

2013-04-29T23:59:59.000Z

262

Response of nanostructured ferritic alloys to high-dose heavy ion irradiation  

SciTech Connect (OSTI)

A latest-generation aberration-corrected scanning/transmission electron microscope (STEM) is used to study heavy-ion-irradiated nanostructured ferritic alloys (NFAs). Results are presented for STEM X-ray mapping of NFA 14YWT irradiated with 10 MeV Pt to 16 or 160 dpa at -100°C and 750°C, as well as pre-irradiation reference material. Irradiation at -100°C results in ballistic destruction of the beneficial microstructural features present in the pre-irradiated reference material, such as Ti-Y-O nanoclusters (NCs) and grain boundary (GB) segregation. Irradiation at 750°C retains these beneficial features, but indicates some coarsening of the NCs, diffusion of Al to the NCs, and a reduction of the Cr-W GB segregation (or solute excess) content. Ion irradiation combined with the latest-generation STEM hardware allows for rapid screening of fusion candidate materials and improved understanding of irradiation-induced microstructural changes in NFAs.

Parish, Chad M.; White, Ryan M.; LeBeau, James M.; Miller, Michael K.

2014-02-01T23:59:59.000Z

263

Competitive egress behaviour: a fuzzy logic-inspired microscopic model  

Science Journals Connector (OSTI)

Some recent tragic events in overcrowded situations, as well as the terrorist threat, have highlighted the importance of the availability of good models for pedestrian behaviour under emergency conditions. Existing approaches to crowd models are generally macroscopic or microscopic. In the first case, the crowd is considered to be like a fluid, so that its movement can be described through differential equations. In the second case, the collective behaviour of the crowd is the result of interactions among individual elements of the system. In this paper, we propose a microscopic model of crowd evacuation that incorporates the fuzzy perception and anxiety embedded in human reasoning. The outcomes of the model application, compared to those obtained by other existing models, seem to be quite satisfactory.

Mauro Dell'Orco

2007-01-01T23:59:59.000Z

264

An Estimate of Biofilm Properties using an Acoustic Microscope  

SciTech Connect (OSTI)

Noninvasive measurements over a biofilm, a three-dimensional community of microorganisms immobilized at a substratum, were made using an acoustic microscope operating at frequencies up to 70 MHz. Spatial variation of surface heterogeneity, thickness, interior structure, and biomass of a living biofilm was estimated over a 2.5-mm by 2.5-mm region. Ultrasound based estimates of thickness were corroborated using optical microscopy and the nominal biofilm thickness was 100 microns. Experimental data showed that the acoustic microscope combined with signal processing was capable of imaging and making quantitative estimates of the spatial distribution of biomass within the biofilm. The revealed surface topology and interior structure of the biofilm provide data for use in advanced biofilm mass transport models. The experimental acoustic and optical systems, methods to estimate of biofilm properties and potential applications for the resulting data are discussed.

Good, Morris S.; Wend, Christopher F.; Bond, Leonard J.; Mclean, Jeffrey S.; Panetta, Paul D.; Ahmed, Salahuddin; Crawford, Susan L.; Daly, Don S.

2006-09-01T23:59:59.000Z

265

Microscopic Optical Potentials for Helium-6 Scattering off Protons  

E-Print Network [OSTI]

The differential cross section and the analyzing power are calculated for elastic scattering of $^6$He from a proton target using a microscopic folding optical potential, in which the $^6$He nucleus is described in terms of a $^4$He-core with two additional neutrons in the valence p-shell. In contrast to previous work of that nature, all contributions from the interaction of the valence neutrons with the target protons are taken into account.

Ch. Elster; A. Orazbayev; S. P. Weppner

2012-09-28T23:59:59.000Z

266

Fermi-level shifts in graphene transistors with dual-cut channels scraped by atomic force microscope tips  

SciTech Connect (OSTI)

We investigate the electronic properties of p-type graphene transistors on silicon dioxide with dual-cut channels that were scraped using atomic force microscope tips. In these devices, the current is forced to squeeze into the path between the two cuts rather than flow directly through the graphene sheet. We observe that the gate voltages with minimum current shift toward zero bias as the sizes of the dual-cut regions increase. These phenomena suggest that the Fermi levels in the dual-cut regions are shifted toward the Dirac points after the mechanical scraping process.

Lin, Meng-Yu [Institute of Electronics, National Taiwan University, Taipei 10617, Taiwan (China); Research Center for Applied Sciences, Academia Sinica, Taipei 11529, Taiwan (China); Chen, Yen-Hao [Department of Photonics, National Chiao Tung University, Hsinchu 30010, Taiwan (China); Su, Chen-Fung [College of Photonics, National Chiao Tung University, Tainan 71150, Taiwan (China); Chang, Shu-Wei [Research Center for Applied Sciences, Academia Sinica, Taipei 11529, Taiwan (China); Department of Photonics, National Chiao Tung University, Hsinchu 30010, Taiwan (China); Lee, Si-Chen [Institute of Electronics, National Taiwan University, Taipei 10617, Taiwan (China); Lin, Shih-Yen, E-mail: shihyen@gate.sinica.edu.tw [Institute of Electronics, National Taiwan University, Taipei 10617, Taiwan (China); Research Center for Applied Sciences, Academia Sinica, Taipei 11529, Taiwan (China); Department of Photonics, National Chiao Tung University, Hsinchu 30010, Taiwan (China)

2014-01-13T23:59:59.000Z

267

A Microscopic Traffic Simulation Model for Transportation Planning in Georgios Papageorgiou, Pantelis Damianou, Andreas Pitsilides  

E-Print Network [OSTI]

A Microscopic Traffic Simulation Model for Transportation Planning in Cyprus Georgios Papageorgiou. This paper presents the microscopic simulation model development of a major traffic network of Nicosia simulation model is developed and utilized for transportation planning. 1. Introduction The demand

Pitsillides, Andreas

268

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope  

SciTech Connect (OSTI)

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p {<=}10{sup -10} mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter [Department of Physics, McGill University, 3600 Rue University, Montreal, QC H3A2T8 (Canada)

2011-11-15T23:59:59.000Z

269

Hands-On and Minds-On Modeling Activities to Improve Students' Conceptions of Microscopic Friction  

E-Print Network [OSTI]

Hands-On and Minds-On Modeling Activities to Improve Students' Conceptions of Microscopic Friction of microscopic friction. We will also present our investigation on the relative effectiveness of the use, it is possible to facilitate the refinement of students' ideas of microscopic friction. Keywords: friction

Zollman, Dean

270

Electron Transfer  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

3 3 Pierre Kennepohl1,2 and Edward Solomon1* 1Department of Chemistry, Stanford University, Stanford, CA 94305 Electron transfer, or the act of moving an electron from one place to another, is amongst the simplest of chemical processes, yet certainly one of the most critical. The process of efficiently and controllably moving electrons around is one of the primary regulation mechanisms in biology. Without stringent control of electrons in living organisms, life could simply not exist. For example, photosynthesis and nitrogen fixation (to name but two of the most well-known biochemical activities) are driven by electron transfer processes. It is unsurprising, therefore, that much effort has been placed on understanding the fundamental principles that control and define the simple act of adding and/or removing electrons from chemical species.

271

Cation Transport in Polymer Electrolytes: A Microscopic Approach  

E-Print Network [OSTI]

A microscopic theory for cation diffusion in polymer electrolytes is presented. Based on a thorough analysis of molecular dynamics simulations on PEO with LiBF$_4$ the mechanisms of cation dynamics are characterised. Cation jumps between polymer chains can be identified as renewal processes. This allows us to obtain an explicit expression for the lithium ion diffusion constant D_{Li} by invoking polymer specific properties such as the Rouse dynamics. This extends previous phenomenological and numerical approaches. In particular, the chain length dependence of D_{Li} can be predicted and compared with experimental data. This dependence can be fully understood without referring to entanglement effects.

A. Maitra; A. Heuer

2007-05-11T23:59:59.000Z

272

Propagation of nonlinearly generated harmonic spin waves in microscopic stripes  

SciTech Connect (OSTI)

We report on the experimental study of the propagation of nonlinearly generated harmonic spin waves in microscopic CoFeB stripes. Using an all electrical technique with coplanar waveguides, we find that two kinds of spin waves can be generated by nonlinear frequency multiplication. One has a non-uniform spatial geometry and thus requires appropriate detector geometry to be identified. The other corresponds to the resonant fundamental propagative spin waves and can be efficiently excited by double- or triple-frequency harmonics with any geometry. Nonlinear excited spin waves are particularly efficient in providing an electrical signal arising from spin wave propagation.

Rousseau, O. [Center for Emergent Matter Science, RIKEN, 2-1 Hirosawa, Wako 351-0198 (Japan); Yamada, M.; Miura, K.; Ogawa, S. [Hitachi, Ltd., Central Research Laboratory, 1-280 Higashi-koigakubo, Kokubunji, Tokyo 185-8601 (Japan); Otani, Y., E-mail: yotani@issp.u-tokyo.ac.jp [Center for Emergent Matter Science, RIKEN, 2-1 Hirosawa, Wako 351-0198 (Japan); Institute for Solid State Physics, University of Tokyo, Kashiwa 277-858 (Japan)

2014-02-07T23:59:59.000Z

273

Calibrated nanoscale dopant profiling using a scanning microwave microscope  

SciTech Connect (OSTI)

The scanning microwave microscope is used for calibrated capacitance spectroscopy and spatially resolved dopant profiling measurements. It consists of an atomic force microscope combined with a vector network analyzer operating between 1-20 GHz. On silicon semiconductor calibration samples with doping concentrations ranging from 10{sup 15} to 10{sup 20} atoms/cm{sup 3}, calibrated capacitance-voltage curves as well as derivative dC/dV curves were acquired. The change of the capacitance and the dC/dV signal is directly related to the dopant concentration allowing for quantitative dopant profiling. The method was tested on various samples with known dopant concentration and the resolution of dopant profiling determined to 20% while the absolute accuracy is within an order of magnitude. Using a modeling approach the dopant profiling calibration curves were analyzed with respect to varying tip diameter and oxide thickness allowing for improvements of the calibration accuracy. Bipolar samples were investigated and nano-scale defect structures and p-n junction interfaces imaged showing potential applications for the study of semiconductor device performance and failure analysis.

Huber, H. P.; Hochleitner, M.; Hinterdorfer, P. [University of Linz, Christian Doppler Laboratory for Nanoscopic Methods in Biophysics, Altenbergerstrasse 69, 4040 Linz (Austria); Humer, I.; Smoliner, J. [Technical University of Vienna, Institute for Solid State Electronics, 1040 Vienna (Austria); Fenner, M.; Moertelmaier, M.; Rankl, C.; Tanbakuchi, H.; Kienberger, F. [Agilent Technologies, Inc., 5301 Stevens Creek Blvd., Santa Clara, California 95051 (United States); Imtiaz, A.; Wallis, T. M.; Kabos, P. [National Institute for Standards and Technology, Electromagnetic Division, 325 Broadway, Boulder, Colorado 80305-3337 (United States); Kopanski, J. J. [National Institute of Standards and Technology, Semiconductor Measurements Division, Gaithersburg, Maryland 20899-8120 (United States)

2012-01-01T23:59:59.000Z

274

Identification of Fragile Microscopic Structures during Mineral Transformations in Wet Supercritical CO2  

SciTech Connect (OSTI)

In this study we examine the nature of highly fragile reaction products that form in low water content super critical carbon dioxide (scCO2) using a combination of scanning electron microscopy/focus ion beam (SEM/FIB), confocal Raman spectroscopy, helium ion microscopy (HeIM), and transmission electron microscopy (TEM). HeIM images show these precipitates to be fragile rosettes that can readily decompose even under slight heating from an electron beam. Using the TEM revealed details on the interfacial structure between the newly formed surface precipitates and the underlying initial solid phases. The detailed microscopic analysis revealed that the growth of the precipitates either followed a tip growth mechanism with precipitates forming directly on the forsterite surface if the initial solid was non-porous (natural forsterite) or growth from the surface of the precipitates where fluid was conducted through the porous (nanoforsterite) agglomerates to the growth center. The mechanism of formation of the hydrated/hydroxylated magnesium carbonate compound (HHMC) phases offers insight into the possible mechanisms of carbonate mineral formation from scCO2 solutions which has recently received a great deal of attention as the result of the potential for CO2 to act as an atmospheric greenhouse gas and impact overall global warming. The techniques used here to examine these fragile structures an also be used to examine a wide range of fragile material surfaces. SEM and FIB technologies have now been brought together in a single instrument, which represents a powerful combination for the studies in biological, geological and materials science.

Arey, Bruce W.; Kovarik, Libor; Qafoku, Odeta; Wang, Zheming; Hess, Nancy J.; Felmy, Andrew R.

2013-04-01T23:59:59.000Z

275

Uranium-contaminated soils: Ultramicrotomy and electron beam analysis  

SciTech Connect (OSTI)

Uranium contaminated soils from the Fernald Operation Site, Ohio, have been examined by a combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM). A method is described for preparing of transmission electron microscopy (TEM) thin sections by ultramicrotomy. By using these thin sections, SEM and TEM images can be compared directly. Uranium was found in iron oxides, silicates (soddyite), phosphates (autunites), and fluorite. Little uranium was associated with clays. The distribution of uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Dietz, N.L.; Bates, J.K.; Cunnane, J.C.

1994-04-01T23:59:59.000Z

276

Use of single scatter electron monte carlo transport for medical radiation sciences  

DOE Patents [OSTI]

The single scatter Monte Carlo code CREEP models precise microscopic interactions of electrons with matter to enhance physical understanding of radiation sciences. It is designed to simulate electrons in any medium, including materials important for biological studies. It simulates each interaction individually by sampling from a library which contains accurate information over a broad range of energies.

Svatos, Michelle M. (Oakland, CA)

2001-01-01T23:59:59.000Z

277

Towards the quantitative analysis of the electron holographic phase images of electrically biased metal tips  

E-Print Network [OSTI]

were acquired at an accelerating voltage of 300 kV using an FEI Titan field emission gun TEM equipped be carried out quantitatively using off-axis electron holography in the transmission electron microscope (TEM by considering the electrostatic potential generated by a line of charges with a density that increases linearly

Dunin-Borkowski, Rafal E.

278

Magnetic interactions within patterned cobalt nanostructures using off-axis electron holography  

E-Print Network [OSTI]

charge-coupled device camera.3 An additional Lorentz minilens Cs 8 m and 1.2 nm line resolution at 200 kV at 200 kV using a Philips CM200-FEG TEM equipped with a field- emission electron source, an electrostatic holography2 in the transmission electron microscope TEM to investigate the magnetic properties of patterned

Dunin-Borkowski, Rafal E.

279

Polarized Electrons  

Science Journals Connector (OSTI)

Since 1972, when the last survey of Polarized Electrons was presented at an International Conference on Atomic Physics, the field has progressed to the point where it has entered a new phase, one which, I beli...

M. S. Lubell

1977-01-01T23:59:59.000Z

280

Electron Bernstein  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

, where pe 2 e 2 n e 0 m e is the plasma frequency and ce eBm e is the cyclotron frequency. However, the elec- trostatic electron Bernstein wave EBW does...

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


281

Recent results from parton cascade and microscopic transport  

E-Print Network [OSTI]

Parton cascade is a microscopic transport approach for the study of the space-time evolution of the Quark-Gluon Plasma produced in relativistic heavy ion collisions and its experimental manifestations. In the following, parton cascade calculations on elliptic flow and thermalization will be discussed. Dynamical evolution is shown to be important for the production of elliptic flow including the scaling and the breaking of the scaling of elliptic flow. The degree of thermalization is estimated using both an elastic parton cascade and a radiative transport model. A longitudinal to transverse pressure ratio, $P_L/P_T\\approx 0.8$, is shown to be expected in the central cell in central collisions. This provides information on viscous corrections to the ideal hydrodynamical approach.

Bin Zhang

2008-09-02T23:59:59.000Z

282

Microscopic return point memory in Co/Pd multilayer films  

SciTech Connect (OSTI)

We report soft x-ray speckle metrology measurements of microscopic return point and complementary point memory in Co/Pd magnetic films having perpendicular anisotropy. We observe that the domains assemble into a common labyrinth phase with a period that varies by nearly a factor of two between initial reversal and fields near saturation. Unlike previous studies of similar systems, the ability of the film to reproduce its domain structure after magnetic cycling through saturation varies from loop to loop, from position to position on the sample, and with the part of the speckle pattern used in the metrology measurements. We report the distribution of memory as a function of field and discuss these results in terms of the reversal process.

Seu, K.A.; Su, R.; Roy, S.; Parks, D.; Shipton, E.; Fullerton, E.E.; Kevan, S.D.

2009-10-01T23:59:59.000Z

283

Microscopic modulation of mechanical properties in transparent insect wings  

SciTech Connect (OSTI)

We report on the measurement of local friction and adhesion of transparent insect wings using an atomic force microscope cantilever down to nanometre length scales. We observe that the wing-surface is decorated with 10??m long and 2??m wide islands that have higher topographic height. The friction on the islands is two orders of magnitude higher than the back-ground while the adhesion on the islands is smaller. Furthermore, the high islands are decorated with ordered nano-wire-like structures while the background is full of randomly distributed granular nano-particles. Coherent optical diffraction through the wings produce a stable diffraction pattern revealing a quasi-periodic organization of the high islands over the entire wing. This suggests a long-range order in the modulation of friction and adhesion which is directly correlated with the topography. The measurements unravel novel functional design of complex wing surface and could find application in miniature biomimetic devices.

Arora, Ashima; Kumar, Pramod; Bhagavathi, Jithin; Singh, Kamal P., E-mail: kpsingh@iisermohali.ac.in; Sheet, Goutam, E-mail: goutam@iisermohali.ac.in [Department of Physical Sciences, Indian Institute of Science Education and Research, Mohali, Punjab 140306 (India)

2014-02-10T23:59:59.000Z

284

Design and Construction of a Low Temperature Scanning Tunneling Microscope  

E-Print Network [OSTI]

and helium temperatures. We analyzed the operational electronic and vibration noises and made some effective improvements. To demonstrate the capabilities of the STM, we obtained atomically resolved images of the Au (111) and graphite surfaces. In addition...

Chen, Chi

2010-10-12T23:59:59.000Z

285

Reflectance and Fluorescence Confocal Microscope for Imaging of the Mouse Colon  

E-Print Network [OSTI]

and fluorescence microscope. 20 3.3 Image Formation To form a 2D image using a point-scanning confocal microscope, the beam must be scanned in two dimensions using scanning mirrors. The PMT records a voltage signal from each point which is assigned... and fluorescence microscope. 20 3.3 Image Formation To form a 2D image using a point-scanning confocal microscope, the beam must be scanned in two dimensions using scanning mirrors. The PMT records a voltage signal from each point which is assigned...

Saldua, Meagan Alyssa

2012-02-14T23:59:59.000Z

286

Simple structured illumination microscope setup with high acquisition speed by using a spatial light modulator  

Science Journals Connector (OSTI)

We describe a two-beam interference structured illumination fluorescence microscope. The novelty of the presented system lies in its simplicity. A programmable spatial light modulator...

Förster, Ronny; Lu-Walther, Hui-Wen; Jost, Aurélie; Kielhorn, Martin; Wicker, Kai; Heintzmann, Rainer

2014-01-01T23:59:59.000Z

287

Electron Impedances  

SciTech Connect (OSTI)

It is only recently, and particularly with the quantum Hall effect and the development of nanoelectronics, that impedances on the scale of molecules, atoms and single electrons have gained attention. In what follows the possibility that characteristic impedances might be defined for the photon and the single free electron is explored is some detail, the premise being that the concepts of electrical and mechanical impedances are relevant to the elementary particle. The scale invariant quantum Hall impedance is pivotal in this exploration, as is the two body problem and Mach's principle.

P Cameron

2011-12-31T23:59:59.000Z

288

Investigation of microscopic radiation damage in waste forms using ODNMR and AEM techniques. (EMSP Project Final Report)  

SciTech Connect (OSTI)

This project seeks to understand the microscopic effects of radiation damage in nuclear waste forms. The authors' approach to this challenge encompasses studies of ceramics and glasses containing short-lived alpha- and beta-emitting actinides with electron microscopy, laser and X-ray spectroscopic techniques, and computational modeling and simulations. In order to obtain information on long-term radiation effects on waste forms, much of the effort is to investigate {alpha}-decay induced microscopic damage in 18-year old samples of crystalline yttrium and lutetium orthophosphates that initially contained {approximately} 1(wt)% of the alpha-emitting isotope {sup 244}Cm (18.1 y half life). Studies also are conducted on borosilicate glasses that contain {sup 244}Cm, {sup 241}Am, or {sup 249}Bk, respectively. The authors attempt to gain clear insights into the properties of radiation-induced structure defects and the consequences of collective defect-environment interactions, which are critical factors in assessing the long-term performance of high-level nuclear waste forms.

Liu, G.; Luo, J.; Beitz, J.; Li, S.; Williams, C.; Zhorin, V.

2000-04-21T23:59:59.000Z

289

Projection Photolithography Utilizing a Schwarzschild Microscope and Self-Assembled Alkanethiol Monolayers as Simple Photoresists  

Science Journals Connector (OSTI)

A high reflectivity mirror (M3) coated for optimal reflection at 308 nm, 45° (?280?330 nm) was employed to guide the UV light into the microscope objective. ... The Schwarzschild microscope is composed of two all-reflective concentric, spherical mirrors (M1 and M2), one concave and one convex. ...

Jane M. Behm; Keith R. Lykke; Michael J. Pellin; John C. Hemminger

1996-04-17T23:59:59.000Z

290

Microscopic theory of protein folding rates. II. Local reaction coordinates and chain dynamics  

E-Print Network [OSTI]

Microscopic theory of protein folding rates. II. Local reaction coordinates and chain dynamics John involved in barrier crossing for protein folding are investigated in terms of the chain dynamics of the polymer backbone, completing the microscopic description of protein folding presented in the preceding

Takada, Shoji

291

Disorder vs. Order 1 Walter J Freeman Brains Create Macroscopic Order from Microscopic  

E-Print Network [OSTI]

interact with them at many levels of complexity. We are constantly bombarded with fields of energy, but only microscopic samples of them at the receptor cells. Each of our sensory ports contains an array of receptors, which are microscopic transducers that convert the kinds of incident energy for which

Freeman, Walter J.

292

Towards a Microscopic Reaction Description Based on Energy Density Functionals  

SciTech Connect (OSTI)

A microscopic calculation of reaction cross sections for nucleon-nucleus scattering has been performed by explicitly coupling the elastic channel to all particle-hole excitations in the target and one-nucleon pickup channels. The particle-hole states may be regarded as doorway states through which the flux flows to more complicated configurations, and subsequently to long-lived compound nucleus resonances. Target excitations for {sup 40,48}Ca, {sup 58}Ni, {sup 90}Zr and {sup 144}Sm were described in a random-phase framework using a Skyrme functional. Reaction cross sections obtained agree very well with experimental data and predictions of a state-of-the-art fitted optical potential. Couplings between inelastic states were found to be negligible, while the pickup channels contribute significantly. The effect of resonances from higher-order channels was assessed. Elastic angular distributions were also calculated within the same method, achieving good agreement with experimental data. For the first time observed absorptions are completely accounted for by explicit channel coupling, for incident energies between 10 and 70 MeV, with consistent angular distribution results.

Nobre, G A; DIetrich, F S; Escher, J E; Thompson, I J; Dupuis, M; Terasaki, J; Engel, J

2011-09-26T23:59:59.000Z

293

Microscopic Origin of Shear Relaxation in Strongly Coupled Yukawa Liquids  

E-Print Network [OSTI]

We report accurate molecular dynamics calculations of the shear stress relaxation in a two-dimensional strongly coupled Yukawa liquid over a wide range of the Coulomb coupling strength $\\Gamma$ and the Debye screening parameter $\\kappa$. Our data on the relaxation times of the ideal- , excess- and total shear stress auto-correlation ($\\tau^{id}_M, \\tau^{ex}_M, \\tau_M$ respectively) along with the lifetime of local atomic connectivity $\\tau_{LC}$ leads us to the following important observation. Below a certain crossover $\\Gamma_c(\\kappa)$, $\\tau_{LC} \\rightarrow \\tau^{ex}_M$, directly implying that here $\\tau_{LC}$ is the microscopic origin of the relaxation of excess shear stress unlike the case for ordinary liquids where it is the origin of the relaxation of the total shear stress. At $\\Gamma >> \\Gamma_c(\\kappa)$ i.e. in the potential energy dominated regime, $\\tau^{ex}_M\\rightarrow \\tau_M$ meaning that $\\tau^{ex}_M$ can fully account for the elastic or "solid like" behavior.

Ashwin J.; Abhijit Sen

2014-08-01T23:59:59.000Z

294

Performance of actinic EUVL mask imaging using a zoneplate microscope  

SciTech Connect (OSTI)

The SEMATECH Berkeley Actinic Inspection Tool (AIT) is a dual-mode, scanning and imaging extreme-ultraviolet (EUV) microscope designed for pre-commercial EUV mask research. Dramatic improvements in image quality have been made by the replacement of several critical optical elements, and the introduction of scanning illumination to improve uniformity and contrast. We report high quality actinic EUV mask imaging with resolutions as low as 100-nm half-pitch, (20-nm, 5x wafer equivalent size), and an assessment of the imaging performance based on several metrics. Modulation transfer function (MTF) measurements show high contrast imaging for features sizes close to the diffraction-limit. An investigation of the illumination coherence shows that AIT imaging is much more coherent than previously anticipated, with {sigma} below 0.2. Flare measurements with several line-widths show a flare contribution on the order of 2-3% relative intensity in dark regions above the 1.3% absorber reflectivity on the test mask used for these experiments. Astigmatism coupled with focal plane tilt are the dominant aberrations we have observed. The AIT routinely records 250-350 high-quality images in numerous through-focus series per 8-hour shift. Typical exposure times range from 0.5 seconds during alignment, to approximately 20 seconds for high-resolution images.

Goldberg, K; Naulleau, P; Barty, A; Rekawa, S; Kemp, C; Gunion, R; Salmassi, F; Gullikson, E; Anderson, E; Han, H

2007-09-25T23:59:59.000Z

295

Microscopic mechanisms of graphene electrolytic delamination from metal substrates  

SciTech Connect (OSTI)

In this paper, hydrogen bubbling delamination of graphene (Gr) from copper using a strong electrolyte (KOH) water solution was performed, focusing on the effect of the KOH concentration (C{sub KOH}) on the Gr delamination rate. A factor of ?10 decrease in the time required for the complete Gr delamination from Cu cathodes with the same geometry was found increasing C{sub KOH} from ?0.05?M to ?0.60?M. After transfer of the separated Gr membranes to SiO{sub 2} substrates by a highly reproducible thermo-compression printing method, an accurate atomic force microscopy investigation of the changes in Gr morphology as a function of C{sub KOH} was performed. Supported by these analyses, a microscopic model of the delamination process has been proposed, where a key role is played by graphene wrinkles acting as nucleation sites for H{sub 2} bubbles at the cathode perimeter. With this approach, the H{sub 2} supersaturation generated at the electrode for different electrolyte concentrations was estimated and the inverse dependence of t{sub d} on C{sub KOH} was quantitatively explained. Although developed in the case of Cu, this analysis is generally valid and can be applied to describe the electrolytic delamination of graphene from several metal substrates.

Fisichella, G. [CNR-IMM, Strada VIII, 5 – 95121 Catania (Italy); Department of Electronic Engineering, University of Catania, Viale A. Doria, 6 – 95125 Catania (Italy); Di Franco, S.; Roccaforte, F.; Giannazzo, F., E-mail: filippo.giannazzo@imm.cnr.it [CNR-IMM, Strada VIII, 5 – 95121 Catania (Italy); Ravesi, S. [STMicroelectronics, Stradale Primosole, 50 – 95121 Catania (Italy)

2014-06-09T23:59:59.000Z

296

Spectro-Microscopic Study of Laser-Modified Carbon Nanotubes  

E-Print Network [OSTI]

production through the arc-discharge evaporation method.(1) Using transmission electron microscopy (TEM is an extremely valuable for energy storage.(8) Besides, it is important for nano-electric devices due to its trimming the CNTs array by focused laser, the turn-on electric field decreases and its emission current

Lin, Minn-Tsong

297

A metrological large range atomic force microscope with improved performance  

Science Journals Connector (OSTI)

A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z -piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyneinterferometers in the x y and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm ( p - v ) . Versatile scanning functions for example radial scanning or local AFM measurement functions have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring for instance the step height lateral pitch line width nanoroughness and other geometrical parameters of nanostructures.Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated showing the excellent metrological performance of the instrument.

Gaoliang Dai; Helmut Wolff; Frank Pohlenz; Hans-Ulrich Danzebrink

2009-01-01T23:59:59.000Z

298

Patterned aluminum nanowires produced by electron beam at the surfaces of AlF3 single crystals  

E-Print Network [OSTI]

Patterned aluminum nanowires produced by electron beam at the surfaces of AlF3 single crystals C is demonstrated for fabricating patterned aluminum nanowires in AlF3 substrate in a scanning electron microscope nanowires of different sizes. The aluminum nanowires may act as nano- interconnects for nanoelectronics

Wang, Zhong L.

299

Electron CoolingElectron Cooling Sergei Nagaitsev  

E-Print Network [OSTI]

Electron CoolingElectron Cooling Sergei Nagaitsev FNAL - AD April 28, 2005 #12;Electron Cooling methods must "get around the theorem" e.g. by pushing phase-space around. #12;Electron Cooling - Nagaitsev 3 TodayToday''s Menus Menu What is cooling? Types of beam cooling Electron cooling Conclusions #12

Fermilab

300

The Electron-Ion Collider Science Case  

E-Print Network [OSTI]

For the first time, physicists are in the position to precisely study a fully relativistic quantum field theory: Quantum ChromoDynamics (QCD). QCD is a central element of the Standard Model and provides the theoretical framework for understanding the strong interaction. This demands a powerful new electron microscope to probe the virtual particles of QCD. Ab initio calculations using lattice gauge theory on the world's most powerful supercomputers are essential for comparison with the data. The new accelerator and computing techniques demand aggressive development of challenging, innovative technologies.

Richard G. Milner

2014-05-27T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


301

Optical analysis of an ultra-high resolution two-mirror soft x-ray microscope  

Science Journals Connector (OSTI)

Promoted by the successful application of multilayer coated optics in soft x-ray imaging experiments in solar physics and projection lithography, several groups have designed, analyzed, fabricated, and are testing Schwarzschild multilayer soft x-ray microscopes. Simulations have indicated that diffraction limited performance of a spherical Schwarzschild microscope operating near 100 Å will be limited to systems with a small numerical aperture of approximately 0.15 and a corresponding resolution, based on the Rayleigh criterion, of 3.3 times the wavelength of the incident radiation. In principle, a two aspherical mirror Head microscope, which satisfies the constant optical path length condition and the Abbé sine condition, should achieve diffraction limited performance for very large numerical apertures. For a practical soft x-ray microscope, surface contour errors, microroughness, reflectance of multilayer coatings, and variation of the angle of incidence over the multilayer substrates become significant factors in degrading system resolution and must be controlled before an ultra-high resolution, two-mirror microscope will be realized. For a 30x reflecting microscope with a numerical aperture ranging from 0.15 to 0.35, the effects on resolution of surface contour errors, tilts, and misalignments of the optics have been studied. Graded spacing of the multilayer coatings on the mirror substrates are required of a fast, two-mirror microscope.

David L. Shealy; Cheng Wang; Richard B. Hoover

1995-01-01T23:59:59.000Z

302

1/27/2014 Microscopic Wind Turbines Offer Renewable Energyon the Go http://oilprice.com/Latest-Energy-News/World-News/Microscopic-Wind-Turbines-Offer-Renewable-Energy-on-the-Go.html 1/3  

E-Print Network [OSTI]

1/27/2014 Microscopic Wind Turbines Offer Renewable Energyon the Go http://oilprice.com/Latest-Energy-News/World-News/Microscopic-Wind-Turbines-Offer-Renewable-Energy-on-the-Go.html 1/3 Log In Sign Up Advertising Contact Us About Contributors Write for Us Forum Home Microscopic Wind Turbines Offer Renewable

Chiao, Jung-Chih

303

Demonstration of achromatic cold-neutron microscope utilizing axisymmetric focusing mirrors  

SciTech Connect (OSTI)

An achromatic cold-neutron microscope with magnification 4 is demonstrated. The image-forming optics is composed of nested coaxial mirrors of full figures of revolution, so-called Wolter optics. The spatial resolution, field of view, and depth of focus are measured and found consistent with ray-tracing simulations. Methods of increasing the resolution and magnification are discussed, as well as the scientific case for the neutron microscope. In contrast to traditional pinhole-camera neutron imaging, the resolution of the microscope is determined by the mirrors rather than by the collimation of the beam, leading to possible dramatic improvements in the signal rate and resolution.

Liu, D.; Khaykovich, B. [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States)] [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States); Hussey, D.; Jacobson, D.; Arif, M. [Physical Measurement Laboratory, NIST, Gaithersburg, Maryland 20899-8461 (United States)] [Physical Measurement Laboratory, NIST, Gaithersburg, Maryland 20899-8461 (United States); Gubarev, M. V.; Ramsey, B. D. [Marshall Space Flight Center, NASA, VP62, Huntsville, Alabama 35812 (United States)] [Marshall Space Flight Center, NASA, VP62, Huntsville, Alabama 35812 (United States); Moncton, D. E. [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States) [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States); Department of Physics, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, Massachusetts 02139 (United States)

2013-05-06T23:59:59.000Z

304

Status of MICROSCOPE, a mission to test the Equivalence Principle in space  

E-Print Network [OSTI]

MICROSCOPE is a French Space Agency mission that aims to test the Weak Equivalence Principle in space down to an accuracy of $10^{-15}$. This is two orders of magnitude better than the current constraints, which will allow us to test General Relativity as well as theories beyond General Relativity which predict a possible Weak Equivalence Principle violation below $10^{-13}$. In this communication, we describe the MICROSCOPE mission, its measurement principle and instrument, and we give an update on its status. After a successful instrument's commissioning, MICROSCOPE is on track for on-schedule launch, expected in 2016.

Bergé, Joel; Rodrigues, Manuel

2015-01-01T23:59:59.000Z

305

Geek-Up[6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes |  

Broader source: Energy.gov (indexed) [DOE]

3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes 3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes Geek-Up[6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes June 3, 2011 - 2:04pm Addthis Novartis Diagnostics scientist Cleo Salisbury and Biological Nanostructures Facility director Ron Zuckermann discuss their collaboration to discover new therapies for Alzheimer's. Niketa Kumar Niketa Kumar Public Affairs Specialist, Office of Public Affairs What does this mean for me? Researchers have developed new inorganic nanocrystal arrays created by spraying a new type of colloidal "ink." Scientists have engineered a technique to help doctors identify Alzheimer's in its early stages and discover new therapies for this disease. Scientists have developed a new type of atomic force microscope that

306

The mechanical design of a proton microscope for radiography at 800 MeV  

SciTech Connect (OSTI)

A proton microscope has been developed for radiography applications using the 800-MeV linear accelerator at the Los Alamos Neutron Science Center (LANSCE). The microscope provides a magnified image of a static device, or of a dynamic event such as a high-speed projectile impacting a target. The microscope assembly consists primarily of four Permanent Magnet Quadrupoles (PMQ's) that are supported on movable platforms. The platform supports, along with the rest of the support structure, are designed to withstand the residual dynamic loads that are expected from the dynamic tests. This paper covers the mechanical design of the microscope assembly, including the remote positioning system that allows for fine-tuning the focus of an object being imaged.

Valdiviez, R. (Robert); Sigler, F. E. (Floyd E.); Barlow, D. B. (David B.); Blind, B. (Barbara); Jason, A. J. (Andrew J.); Mottershead, C. T.; Gomez, J. J. (John J.); Espinoza, C. J. (Camilo J.)

2003-01-01T23:59:59.000Z

307

Microscopic description of isoscalar giant resonance excitations in ??Ca and ¹¹?SN nuclei  

E-Print Network [OSTI]

This thesis presents a microscopic description of isoscalar giant resonance excitations in ??Ca and ¹¹? Sn nuclei within the self-consistent Skyrme-Hartree-Fock-Random-Phase-Approximation (HF-RPA) theory. Such characteristic features...

Karki, Bhishma

2000-01-01T23:59:59.000Z

308

Demonstration of achromatic cold-neutron microscope utilizing axisymmetric focusing mirrors  

E-Print Network [OSTI]

An achromatic cold-neutron microscope with magnification 4 is demonstrated. The image-forming optics is composed of nested coaxial mirrors of full figures of revolution, so-called Wolter optics. The spatial resolution, ...

Liu, Dazhi

309

Isospin-dependent relativistic microscopic optical potential in the Dirac Brueckner-Hartree-Fock method  

Science Journals Connector (OSTI)

The relativistic microscopic optical potential in the asymmetric nuclear matter is studied in the framework of the Dirac Brueckner-Hartree-Fock method. A new decomposition of...E>0 in nuclear matter is calculated...

Jian Rong; Zhongyu Ma

2004-03-01T23:59:59.000Z

310

AUTOMATED DETERMINATION OF PROTEIN SUBCELLULAR LOCATIONS FROM 3D FLUORESCENCE MICROSCOPE IMAGES  

E-Print Network [OSTI]

features (termed SLF for Subcellular Location Features) computed from 2D fluorescence microscope images [4]. We have shown the SLF to accurately represent the complexity in such images by using them

Gordon, Geoffrey J.

311

Optimal Design of Multilayer Mirrors for Water-Window Microscope Optics  

Science Journals Connector (OSTI)

A small bandwidth of periodic multilayers at wavelengths 2.4–4.4 nm presents problems for the spectral matching of mirrors. This leads to low throughput of a Schwarzschild microscope and its sensitivity to techno...

Yurii Uspenskii; Denis Burenkov; Tadashi Hatano; Masaki Yamamoto

312

Simultaneous calibration of a microscopic traffic simulation model and OD matrix  

E-Print Network [OSTI]

With the recent widespread deployment of intelligent transportation systems (ITS) in North America there is an abundance of data on traffic systems and thus an opportunity to use these data in the calibration of microscopic traffic simulation models...

Kim, Seung-Jun

2006-10-30T23:59:59.000Z

313

Low energy ($p,?$) reactions in Ni and Cu nuclei using microscopic optical model  

E-Print Network [OSTI]

Radiative capture reactions for low energy protons have been theoretically studied for Ni and Cu isotopes using the microscopic optical model. The optical potential has been obtained in the folding model using different microscopic interactions with the nuclear densities from Relativistic Mean Field calculations. The calculated total cross sections as well as the cross sections for individually low lying levels have been compared with measurements involving stable nuclear targets. Rates for the rapid proton capture process have been evaluated for astrophysically important reactions.

G. Gangopadhyay

2010-08-05T23:59:59.000Z

314

Application of Microscopic Simulation to Evaluate the Safety Performance of Freeway Weaving Sections  

E-Print Network [OSTI]

APPLICATION OF MICROSCOPIC SIMULATION TO EVALUATE THE SAFETY PERFORMANCE OF FREEWAY WEAVING SECTIONS A Thesis by THANH QUANG LE Submitted to the Office of Graduate Studies of Texas A&M University in partial fulfillment... of the requirements for the degree of MASTER OF SCIENCE December 2009 Major Subject: Civil Engineering APPLICATION OF MICROSCOPIC SIMULATION TO EVALUATE THE SAFETY PERFORMANCE OF FREEWAY WEAVING SECTIONS A Thesis by THANH QUANG LE...

Le, Thanh Quang

2011-02-22T23:59:59.000Z

315

Developing Next-Generation Multimodal Chemical Imaging Capability by Combining STEM/APT/STXM/HIM  

E-Print Network [OSTI]

Developing Next-Generation Multimodal Chemical Imaging Capability by Combining STEM battery cathode materials at sub-nanometer spatial and chemical resolution and ppm-level mass sensitivity Develop a common analysis platform for integrating aberration-corrected transmission electron microscopy

316

Reconstruction of an InAs nanowire using geometric and algebraic tomography  

E-Print Network [OSTI]

was acquired using a probe-aberration-corrected FEI Titan 80-300 operated at 300 kV with a probe convergence-angle annular dark-field scanning transmission electron microscopy (HAADF STEM) image series of an InAs nanowire and two representative HAADF STEM images and line profiles from the tilt series are shown in Fig. 1. SIRT

Dunin-Borkowski, Rafal E.

317

Role of Electronic Excitations in Ion Collisions with Carbon Nanostructures  

SciTech Connect (OSTI)

By combining ab initio time-dependent density functional calculations for electrons with molecular dynamics simulations for ions in real time, we investigate the microscopic mechanism of collisions between energetic protons and graphitic carbon nanostructures. We identify not only the amount of energy lost by the projectile, but also the electronic and ionic degrees of freedom of the target that accommodate this energy as a function of the impact parameter and projectile energy. Our results establish validity limits for the Born-Oppenheimer approximation and the threshold energy for defect formation in carbon nanostructures.

Krasheninnikov, Arkady V. [Accelerator Laboratory, P.O. Box 43, FIN-00014 University of Helsinki (Finland); Laboratory of Physics, Helsinki University of Technology, P.O. Box 1100, Helsinki 02015 (Finland); Miyamoto, Yoshiyuki [Nano Electronics Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, 305-8501 (Japan); Tomanek, David [Physics and Astronomy Department, Michigan State University, East Lansing, Michigan 48824-2320 (United States)

2007-07-06T23:59:59.000Z

318

Compact UHV system for fabrication and in situ analysis of electron beam deposited structures using a focused low energy electron beam  

SciTech Connect (OSTI)

A compact UHV system was developed in order to fabricate and analyze micro- and nanostructures on surfaces in situ. The system includes a low energy electron gun which provides a minimum spot size of {approx}25 nm in a diameter using electrostatic lenses, a cylindrical mirror analyzer for Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS), a low energy electron diffraction (LEED) optics, and a scintillation counter for scanning electron microscopy. Thus, we can analyze electronic states of specific microstructures on surfaces. In addition, we can fabricate microscopic structures artificially by means of scanning a focused electron beam. In this article, first we show the performance of the present analysis system. Next, we provide an example of the fabrication of iron microstructures by electron-induced deposition of iron pentacarbonyl [Fe(CO){sub 5}]. We successfully analyzed the amount and chemical states of deposited iron by AES in situ. We also investigated coverage dependence of electronic structure and surface periodic structure by EELS and LEED measurements, respectively. Thus, this system enables us to fabricate and analyze microscopic structures on surfaces in situ.

Kakefuda, Y.; Yamashita, Y.; Mukai, K.; Yoshinobu, J. [Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581 (Japan)

2006-05-15T23:59:59.000Z

319

The Thirty-seventh Annual Meeting of the Japanese Society of Electron Microscopy  

Science Journals Connector (OSTI)

......stain and weakly posi- tive in PAS, Sudan B and Luxol Fast Blue. Electron microscopically...type. In these experiments, in situ thermal stability of dislocations, phase transformation...fuel and fuel cladding material due to thermal and fast neutrons. For obtaining examina......

Morris J. KARNOVSKY

1981-01-01T23:59:59.000Z

320

Quantitative Examination of Reverse-Biased Semiconductor Devices using Off-Axis Electron Holography  

E-Print Network [OSTI]

-machined in the cleaved samples using focused ion beam (FIB) milling (Fig. 1b). Figure 2a shows a 200 kV holographic phase using a field emission gun transmission electron microscope (FEGTEM) [1]. The technique uses layer that runs around its entire surface. A line trace showing the phase profile across the junction

Dunin-Borkowski, Rafal E.

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


321

Optically pulsed electron accelerator  

DOE Patents [OSTI]

An optically pulsed electron accelerator can be used as an injector for a free electron laser and comprises a pulsed light source, such as a laser, for providing discrete incident light pulses. A photoemissive electron source emits electron bursts having the same duration as the incident light pulses when impinged upon by same. The photoemissive electron source is located on an inside wall of a radiofrequency-powered accelerator cell which accelerates the electron burst emitted by the photoemissive electron source.

Fraser, J.S.; Sheffield, R.L.

1985-05-20T23:59:59.000Z

322

Optically pulsed electron accelerator  

DOE Patents [OSTI]

An optically pulsed electron accelerator can be used as an injector for a free electron laser and comprises a pulsed light source, such as a laser, for providing discrete incident light pulses. A photoemissive electron source emits electron bursts having the same duration as the incident light pulses when impinged upon by same. The photoemissive electron source is located on an inside wall of a radio frequency powered accelerator cell which accelerates the electron burst emitted by the photoemissive electron source.

Fraser, John S. (Los Alamos, NM); Sheffield, Richard L. (Los Alamos, NM)

1987-01-01T23:59:59.000Z

323

Electron Microscopic and Peroxidase Cytochemical Analysis of Pink Pseudo-Chediak-Higashi Granules in Acute Myelogenous Leukemia  

Science Journals Connector (OSTI)

...California. However, it is interesting to note that other investi gators have had difficulty demonstrating peroxidase in PER and Golgi...myeloid cells of patients with acute leukemia by many investi gators (1, 3, 5, 6, 8, 9, 11 -14, 24, 25, 36, 37, 41...

William A. Dittman; Robert J. Kramer; Dorothy F. Bainton

1980-12-01T23:59:59.000Z

324

Transmission electron microscope study of polyphase and discordant monazites: Site-specific specimen preparation using the focused ion beam technique  

Science Journals Connector (OSTI)

...nm thick (for technical details, see Overwijk et al., 1993; Young, 1997; Roberts...Chemical Geology, v. 191p. 89-104. Overwijk, M.H.F., van den Heuvel, F...nm thick (for technical details, see Overwijk et al., 1993; Young, 1997; Roberts...

325

Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture  

Science Journals Connector (OSTI)

......analysis at atomic dimensions. Cryst. Res. Technol. (2005) 40:149-160. doi:10.1002/crat.200410318 . 4 Thust A , Overwijk M H F, Coene W M J, Lentzen M. Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy (1996......

Shigeyuki Morishita; Jun Yamasaki; Nobuo Tanaka

2011-04-01T23:59:59.000Z

326

In situ ATR-IR spectroscopic and electron microscopic analyses of settlement secretions of Undaria pinnatifida kelp spores  

Science Journals Connector (OSTI)

...and anionic polysaccharides. Energy dispersive X-ray microanalysis...to Australia, New Zealand, Argentina, southern California (USA...is influenced by the surface energy, wettability, modulus and...Phaeophyta) in Golfo Nuevo, Argentina. Hydrobiologia 326/327...

2011-01-01T23:59:59.000Z

327

The Fine Structure of the So-called Crystalloid Body of the Human Retina as Observed with the Electron Microscope  

Science Journals Connector (OSTI)

......University of Texas Medical Branch, Galveston, Texas. The crystalloid body of Kolmer...University of Texas Medical Branch, Galveston, Texas. Materials and Methods Human...University of Texas Medical Branch, Galveston, Texas, for his kindness. Addendum......

Masao YOSHIDA

1965-01-01T23:59:59.000Z

328

Glossary Term - Electron Capture  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Electron Previous Term (Electron) Glossary Main Index Next Term (Electron Volt (eV)) Electron Volt (eV) Electron Capture After electron capture, an atom contains one less proton and one more neutron. Electron capture is one process that unstable atoms can use to become more stable. During electron capture, an electron in an atom's inner shell is drawn into the nucleus where it combines with a proton, forming a neutron and a neutrino. The neutrino is ejected from the atom's nucleus. Since an atom loses a proton during electron capture, it changes from one element to another. For example, after undergoing electron capture, an atom of carbon (with 6 protons) becomes an atom of boron (with 5 protons). Although the numbers of protons and neutrons in an atom's nucleus change

329

Advanced simulation of electron heat transport in fusion plasmas  

SciTech Connect (OSTI)

Electron transport in burning plasmas is more important since fusion products first heat electrons. First-principles simulations of electron turbulence are much more challenging due to the multi-scale dynamics of the electron turbulence, and have been made possible by close collaborations between plasma physicists and computational scientists. The GTC simulations of collisionless trapped electron mode (CTEM) turbulence show that the electron heat transport exhibits a gradual transition from Bohm to gyroBohm scaling when the device size is increased. The deviation from the gyroBohm scaling can be induced by large turbulence eddies, turbulence spreading, and non-diffusive transport processes. Analysis of radial correlation function shows that CTEM turbulence eddies are predominantly microscopic but with a significant tail in the mesoscale. A comprehensive analysis of kinetic and fluid time scales shows that zonal flow shearing is the dominant decorrelation mechanism. The mesoscale eddies result from a dynamical process of linear streamers breaking by zonal flows and merging of microscopic eddies. The radial profile of the electron heat conductivity only follows the profile of fluctuation intensity on a global scale, whereas the ion transport tracks more sensitively the local fluctuation intensity. This suggests the existence of a nondiffusive component in the electron heat flux, which arises from the ballistic radial E x B drift of trapped electrons due to a combination of the presence of mesoscale eddies and the weak de-tuning of the toroidal precessional resonance that drives the CTEM instability. On the other hand, the ion radial excursion is not affected by the mesoscale eddies due to a parallel decorrelation, which is not operational for the trapped electrons because of a bounce averaging process associated with the electron fast motion along magnetic field lines. The presence of the nondiffusive component raises question on the applicability of the usual quasilinear theory for the CTEM electron transport. This is in contrast to the good agreement between the quasilinear transport theory and simulation results of the electron heat transport in electron temperature gradient (ETG) turbulence, which is regulated by a wave-particle decorrelation. Therefore, the transport in the CTEM turbulence is a fluid-like eddy mixing process even though the linear CTEM instability is driven by a kinetic resonance. In contrast, a kinetic process dominates the transport in the ETG turbulence, which is characterized by macroscopic streamers.

Lin, Zhihong [University of California, Irvine; Xiao, Y. [University of California, Irvine; Klasky, Scott A [ORNL; Lofstead, J. [Georgia Institute of Technology

2009-01-01T23:59:59.000Z

330

Design and analysis of multilayer X ray/XUV microscope. Final Report, 1 May 1989 - 31 Jan. 1990  

SciTech Connect (OSTI)

The design and analysis of a large number of normal incidence multilayer x ray microscopes based on the spherical mirror Schwarzschild configuration is examined. Design equations for the spherical mirror Schwarzschild microscopes are summarized and used to evaluate mirror parameters for microscopes with magnifications ranging from 2 to 50x. Ray tracing and diffraction analyses are carried out for many microscope configurations to determine image resolution as a function of system parameters. The results are summarized in three publication included herein. A preliminary study of advanced reflecting microscope configurations, where aspherics are used in place of the spherical microscope mirror elements, has indicated that the aspherical elements will improve off-axis image resolution and increase the effective field of view.

Shealy, D.L.

1990-04-01T23:59:59.000Z

331

Detection and measurement of electroreflectance on quantum cascade laser device using Fourier transform infrared microscope  

SciTech Connect (OSTI)

We demonstrate the use of a Fourier Transform Infrared microscope system to detect and measure electroreflectance (ER) from mid-infrared quantum cascade laser (QCL) device. To characterize intersubband transition (ISBT) energies in a functioning QCL device, a microscope is used to focus the probe on the QCL cleaved mirror. The measured ER spectra exhibit resonance features associated to ISBTs under applied electric field in agreement with the numerical calculations and comparable to observed photocurrent, and emission peaks. The method demonstrates the potential as a characterization tool for QCL devices.

Enobio, Eli Christopher I.; Ohtani, Keita; Ohno, Yuzo; Ohno, Hideo, E-mail: ohno@riec.tohoku.ac.jp [Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577 (Japan)] [Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577 (Japan)

2013-12-02T23:59:59.000Z

332

Controlling Graphene's Electronic Structure  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in...

333

Controlling Graphene's Electronic Structure  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Controlling Graphene's Electronic Structure Print Wednesday, 25 April 2007 00:00 Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has...

334

Diamondoids Improve Electron Emitters  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

is unique to diamondoid, is believed to enable the development of a new generation of electron emitters with unprecedented properties. In Photoemission Electron Microscopy...

335

Radiative polarization of electrons  

Science Journals Connector (OSTI)

We present a new method of calculating the radiative polarization of electrons in homogeneous magnetic fields, using the modified electron propagation function.

Julian Schwinger and Wu-yang Tsai

1974-03-15T23:59:59.000Z

336

Gas mixing system for imaging of nanomaterials under dynamic environments by environmental transmission electron microscopy  

SciTech Connect (OSTI)

A gas mixing manifold system that is capable of delivering a stable pressure stream of a desired composition of gases into an environmental transmission electron microscope has been developed. The system is designed to provide a stable imaging environment upon changes of either the composition of the gas mixture or upon switching from one gas to another. The design of the system is described and the response of the pressure inside the microscope, the sample temperature, and sample drift in response to flow and composition changes of the system are reported.

Akatay, M. Cem [School of Materials Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907 (United States)] [School of Materials Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907 (United States); Zvinevich, Yury; Ribeiro, Fabio H., E-mail: fabio@purdue.edu, E-mail: estach@bnl.gov [Forney Hall of Chemical Engineering, Purdue University, West Lafayette, Indiana 47907 (United States); Baumann, Philipp [Computer Sciences, University of Applied Sciences of Northeastern Switzerland, 4132 Muttenz, Switzerland and Department of Physics, Yeshiva University, New York, New York 10016 (United States)] [Computer Sciences, University of Applied Sciences of Northeastern Switzerland, 4132 Muttenz, Switzerland and Department of Physics, Yeshiva University, New York, New York 10016 (United States); Stach, Eric A., E-mail: fabio@purdue.edu, E-mail: estach@bnl.gov [Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973 (United States)

2014-03-15T23:59:59.000Z

337

Tunneling spectroscopy study of YBa2Cu3O7 thin films using a cryogenic scanning tunneling microscope  

Science Journals Connector (OSTI)

We have measured reproducible tunneling spectra on YBa2Cu3O7 (Tc?85 K) thin films (thickness ?2 ?m) with a cryogenic scanning tunneling microscope. We find that the I-V curves are generally of three types. The most common type, featured in a large majority of the data, shows a region of high conductance at zero bias. The amplitude of this region is inversely proportional to the tunneling resistance between the tip and sample. It is possible that this can be explained in terms of Josephson effects within the films, although an alternative is given based on electronic self-energy corrections. Data showing capacitive charging steps are analyzed in terms of two ultrasmall tunnel junctions in series.. Theoretical fits to the data give specific values of the junction parameters that are consistent with the assumed geometry of the tip probing an individual grain of the film. The third type of I-V curves exhibits negative differential resistance. We conclude that this phenomenon is probably due to tunneling to localized states in the surface oxide. We also present and discuss data with energy-gap-like behavior; the best example gives ? to be about 27 mV.

R. Wilkins, M. Amman, R. E. Soltis, E. Ben-Jacob, and R. C. Jaklevic

1990-05-01T23:59:59.000Z

338

ELECTRONIC CHARTS INTRODUCTION  

E-Print Network [OSTI]

199 CHAPTER 14 ELECTRONIC CHARTS INTRODUCTION 1400. The Importance of Electronic Charts Since. Electronic charts automate the process of integrating real-time positions with the chart display and allow is expected to take and plot a fix every three minutes. An electronic chart system can do it once per second

New Hampshire, University of

339

Electronics, Electrical Engineering  

E-Print Network [OSTI]

SCHOOL OF Electronics, Electrical Engineering and Computer Science IS IN YOUR HANDS THE FUTURE #12;SCHOOL OF Electronics, Electrical Engineering and Computer Science2 CAREERS IN ELECTRONICS, ELECTRICAL Belfast. Ranked among the top 100 in the world for Electrical and Electronic Engineering (QS World

340

1 Microscopic and environmental controls on the spacing and thickness of segregated 2 ice lenses  

E-Print Network [OSTI]

water, and ice conspire with the prevailing environmental conditions 52 to produce macroscopic ice by Henry (2000). The first comprehensive and tractable model 57 for ice lens growth was produced by O1 Microscopic and environmental controls on the spacing and thickness of segregated 2 ice lenses 3

Rempel, Alan W.

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


341

EST-CE QU'ON VOlT ATRAVERS UN MICROSCOPE? '  

E-Print Network [OSTI]

speculations philosophiques. *Ian Hacking, «Do we see through a microscope?», P~cifi: Ph~loso phical Quarterly. Texte de Ian Hacking extrait de : Philosophie des sciences - Tome 2 : Naturalismes et réalismes Dirigé par Sandra Laugier , Pierre Wagner Ed. Vrin, Paris #12;240 IAN HACKING LA GRANDE CHAiNE DES ETRES Le

Aubin, David

342

NUCLEAR SEGMENTATION IN MICROSCOPE CELL IMAGES: A HAND-SEGMENTED DATASET AND COMPARISON OF ALGORITHMS  

E-Print Network [OSTI]

NUCLEAR SEGMENTATION IN MICROSCOPE CELL IMAGES: A HAND-SEGMENTED DATASET AND COMPARISON. The hand-labeled dataset (and all software used to com- pare methods) is publicly available to enable, Image seg- mentation 1. INTRODUCTION Nuclear segmentation is an important step in the pipeline of many

Gordon, Geoffrey J.

343

Electric-Field Control of Magnetism Intrinsic magnetoelectric coupling describes the microscopic interaction between magnetic and  

E-Print Network [OSTI]

Electric-Field Control of Magnetism Intrinsic magnetoelectric coupling describes the microscopic interaction between magnetic and electric polarization in a single-phase material. The control of the magnetic state of a material with an electric field is an enticing prospect for device engineering. MRSEC

Maroncelli, Mark

344

Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer  

DOE Patents [OSTI]

An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

Fink, Samuel D. (Aiken, SC); Fondeur, Fernando F. (North Augusta, SC)

2011-10-18T23:59:59.000Z

345

Microscopic optical potentials of the nucleon-nucleus elastic scattering at medium energies  

E-Print Network [OSTI]

Microscopic optical potentials of the nucleon-nucleus elastic scattering at medium energies R interpreted in terms of the phenomenological optical model potential [1]. At medium and high energies of the optical model approach at medium energies has also some theoretical founda- tions. At a sufficiently large

Paris-Sud XI, Université de

346

Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscope  

E-Print Network [OSTI]

experimentally shown to be conductive.8­10 However, RE metal silicide NWs are easily oxidized, so that inert NWs similarly to RE metal silicide NWs.11 It is essential to study the electrical properties, especiallyLow resistivity of Pt silicide nanowires measured using double-scanning- probe tunneling microscope

Kim, Sehun

347

IMAGE CONTENT-BASED RETRIEVAL AND AUTOMATED INTERPRETATION OF FLUORESCENCE MICROSCOPE IMAGES VIA THE  

E-Print Network [OSTI]

to microscope images. Our group has developed sets of Subcellular Location Features (SLF) and demonstrated. More significantly, we demonstrate that the use of the SLF can provide automated interpretation-vocabulary means for entering the annotations and also triggers calculation of the SLF features for each cell

Gordon, Geoffrey J.

348

Characterization of grain boundary conductivity of spin-sprayed ferrites using scanning microwave microscope  

SciTech Connect (OSTI)

Grain boundary electrical conductivity of ferrite materials has been characterized using scanning microwave microscope. Structural, electrical, and magnetic properties of Fe{sub 3}O{sub 4} spin-sprayed thin films onto glass substrates for different length of growth times were investigated using a scanning microwave microscope, an atomic force microscope, a four-point probe measurement, and a made in house transmission line based magnetic permeameter. The real part of the magnetic permeability shows almost constant between 10 and 300?MHz. As the Fe{sub 3}O{sub 4} film thickness increases, the grain size becomes larger, leading to a higher DC conductivity. However, the loss in the Fe{sub 3}O{sub 4} films at high frequency does not increase correspondingly. By measuring the reflection coefficient s{sub 11} from the scanning microwave microscope, it turns out that the grain boundaries of the Fe{sub 3}O{sub 4} films exhibit higher electric conductivity than the grains, which contributes loss at radio frequencies. This result will provide guidance for further improvement of low loss ferrite materials for high frequency applications.

Myers, J.; Nicodemus, T.; Zhuang, Y., E-mail: yan.zhuang@wright.edu [Department of Electrical Engineering, Wright State University, Dayton, Ohio 45435 (United States); Watanabe, T.; Matsushita, N. [Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama (Japan); Yamaguchi, M. [Department of Electrical Engineering, Tohoku University, Sendai 980-8579 (Japan)

2014-05-07T23:59:59.000Z

349

Performance Evaluation of Adaptive Ramp-Metering Algorithms Using Microscopic Traffic Simulation Model  

E-Print Network [OSTI]

to implementation on the target freeway network. In this paper, a capability-enhanced PARAMICS simulation model has evaluation; Simulation models; Algorithms. Introduction Ramp metering has been recognized as an effectivePerformance Evaluation of Adaptive Ramp-Metering Algorithms Using Microscopic Traffic Simulation

Levinson, David M.

350

OIL IN THE OPEN WATER microscopic plants and animals that form the  

E-Print Network [OSTI]

OIL IN THE OPEN WATER microscopic plants and animals that form the basis of the oceanic food web the surface, corals and other deepwater OIL AND HUMAN USE Wellhead CORALS · Coral surveys · Tissue collections · Transect surveys to detect submerged oil · Oil plume modeling · Sediment sampling AQUATIC VEGETATION

351

Microscopic models of quasicrystals J. Jdrzejewski and J. Mikisz, Devil's staircase for nonconvex interactions,  

E-Print Network [OSTI]

Microscopic models of quasicrystals J. Jdrzejewski and J. Mikisz, Devil's staircase for nonconvex-dimensional infinite-range lattice-gas interactions, molecules consisting of two particles form a molecular devil's staircase in the unique ground- state measure. The structure of the ground set is that of a Cantor set

Miekisz, Jacek

352

Bibliography [1] D. Gabor, A new microscopic principle, Nature (London) 161, 777 (1948).  

E-Print Network [OSTI]

, Intensity distributions in electron interference phenomena pro- duced by an electrostatic biprism, Optica

353

Coherence of Electron Wave and Contrast of Electron Image  

Science Journals Connector (OSTI)

......other Symposium of the Society of Japanese Electron Microscopy Coherence of Electron Wave and Contrast of Electron Image Tadatoshi...Measurements, Tohoku University (21) 207 0 Jfc & ft* ffi Coherence of Electron Wave and Contrast of Electron Image Tadatoshi......

Tadatoshi HIBI; Shoichi Takahashi

1964-01-01T23:59:59.000Z

354

Superposition model analysis from polarized electronic absorption  

Science Journals Connector (OSTI)

Polarized electronic absorption spectra of Co2+ in trigonally compressed octahedra in brucite-type Co(OH)2 have been measured at 290 and 90 K by microscope-spectrometric techniques and analysed in terms of the superposition model (SM) of crystal fields. The resulting SM and interelectronic repulsion parameters are 4 = 5260, 2 = 4920, Racah B = 825, Racah C = 3550 cm-1 at 290 K and 4 = 5320, 2 = 3900, Racah B = 830, Racah C = 3500 cm-1 at 90 K (R0 = 2.1115 Å; fixed exponential and spin-orbit parameters t4 = 5, t2 = 3, ? = 500 cm-1). Together with a recent SM analysis of Li2Co3(SeO3)4, the k refined for Co(OH)2 further confine the magnitude of the hitherto unknown `correct' SM parameters of Co2+ for future application to structurally and/or chemically less well defined systems.

M Andrut; M Wildner

2001-01-01T23:59:59.000Z

355

Atomic resolution electrostatic potential mapping of graphene sheets by off-axis electron holography  

SciTech Connect (OSTI)

Off-axis electron holography has been performed at atomic resolution with the microscope operated at 80?kV to provide electrostatic potential maps from single, double, and triple layer graphene. These electron holograms have been reconstructed in order to obtain information about atomically resolved and mean inner potentials. We propose that off-axis electron holography can now be used to measure the electrical properties in a range of two-dimensional semiconductor materials and three dimensional devices comprising stacked layers of films to provide important information about their electrical properties.

Cooper, David, E-mail: david.cooper@cea.fr [University Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054, Grenoble (France); Pan, Cheng-Ta; Haigh, Sarah [School of Materials, The University of Manchester, Manchester M13 9PL (United Kingdom)

2014-06-21T23:59:59.000Z

356

Analytical electron microscopy characterization of uranium-contaminated soils from the Fernald Site, FY1993 report  

SciTech Connect (OSTI)

A combination of optical microscopy, scanning electron microscopy with backscattered electron detection (SEM/BSE), and analytical electron microscopy (AEM) is being used to determine the nature of uranium in soils from the Fernald Environmental Management Project. The information gained from these studies is being used to develop and test remediation technologies. Investigations using SEM have shown that uranium is contained within particles that are typically 1 to 100 {mu}m in diameter. Further analysis with AEM has shown that these uranium-rich regions are made up of discrete uranium-bearing phases. The distribution of these uranium phases was found to be inhomogeneous at the microscopic level.

Buck, E.C.; Cunnane, J.C.; Brown, N.R.; Dietz, N.L.

1994-10-01T23:59:59.000Z

357

Plastic behavior of fcc metals over a wide range of strain: Macroscopic and microscopic descriptions and their relationship  

E-Print Network [OSTI]

Plastic behavior of fcc metals over a wide range of strain: Macroscopic and microscopic The room temperature macroscopic and microscopic plastic behavior of four face-centered cubic metals (Al dislocations during plastic flow. It is shown that forest dislocations develop primarily due to interaction

Gubicza, Jenõ

358

ME EET Seminar: Nanomanufacturing of Flexible Electronics and Energy  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

ME EET Seminar: Nanomanufacturing of Flexible Electronics and Energy ME EET Seminar: Nanomanufacturing of Flexible Electronics and Energy Systems Speaker(s): Costas Grigoropoulos Date: October 28, 2009 - 12:00pm Location: 90-3122 This talk presents an overview of recent work conducted on the nanomanufacturing of flexible electronics and energy systems. Pulsed lasers have been coupled to near-field-scanning optical microscopes (NSOMs) for nanoprocessing, nanomachining, nanolithography and nanodeposition. Interactions of pulsed laser radiation with nanostructures are investigated and shown to substantially improve contact resistance and device performance compared to furnace annealing. New concepts have been demonstrated for the high throughput, directed growth and assembly of nanostructures. Maskless fabrication of functional devices on flexible

359

Integrated Dynamic Electron Solutions, Inc. | Department of Energy  

Broader source: Energy.gov (indexed) [DOE]

Integrated Integrated Dynamic Electron Solutions, Inc. America's Next Top Energy Innovator Challenge 333 likes Integrated Dynamic Electron Solutions, Inc. Lawrence Livermore National Laboratory Dynamic Transmission Electron Microscopes DTEM reveal unprecedented details of the mechanisms underlying a host of nanoscale systems that are at the core of our current and future energy economy. A vast and growing number of materials utilized in the energy sector rely on nanostructured materials and their unique dynamic behaviors. DTEM offers researchers the ability to directly interrogate these materials at time and length scales that to-date have either been impossible to access or required the use of multi-billion dollar synchrotrons. DTEM will fundamentally change the approach to basic and applied research in the

360

Integrated Dynamic Electron Solutions, Inc. | Department of Energy  

Broader source: Energy.gov (indexed) [DOE]

Integrated Integrated Dynamic Electron Solutions, Inc. America's Next Top Energy Innovator Challenge 333 likes Integrated Dynamic Electron Solutions, Inc. Lawrence Livermore National Laboratory Dynamic Transmission Electron Microscopes DTEM reveal unprecedented details of the mechanisms underlying a host of nanoscale systems that are at the core of our current and future energy economy. A vast and growing number of materials utilized in the energy sector rely on nanostructured materials and their unique dynamic behaviors. DTEM offers researchers the ability to directly interrogate these materials at time and length scales that to-date have either been impossible to access or required the use of multi-billion dollar synchrotrons. DTEM will fundamentally change the approach to basic and applied research in the

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


361

Integrated Dynamic Electron Solutions, Inc. | Department of Energy  

Broader source: Energy.gov (indexed) [DOE]

Integrated Integrated Dynamic Electron Solutions, Inc. America's Next Top Energy Innovator Challenge 333 likes Integrated Dynamic Electron Solutions, Inc. Lawrence Livermore National Laboratory Dynamic Transmission Electron Microscopes DTEM reveal unprecedented details of the mechanisms underlying a host of nanoscale systems that are at the core of our current and future energy economy. A vast and growing number of materials utilized in the energy sector rely on nanostructured materials and their unique dynamic behaviors. DTEM offers researchers the ability to directly interrogate these materials at time and length scales that to-date have either been impossible to access or required the use of multi-billion dollar synchrotrons. DTEM will fundamentally change the approach to basic and applied research in the

362

In-Situ Electrochemical Transmission Electron Microscopy for Battery Research  

SciTech Connect (OSTI)

The recent development of in-situ liquid stages for (scanning) transmission electron microscopes now makes it possible for us to study the details of electrochemical processes under operando conditions. As electrochemical processes are complex, care must be taken to calibrate the system before any in-situ/operando observations. In addition, as the electron beam can cause effects that look similar to electrochemical processes at the electrolyte/electrode interface, an understanding of the role of the electron beam in modifying the operando observations must also be understood. In this paper we describe the design, assembly, and operation of an in-situ electrochemical cell, paying particular attention to the method for controlling and quantifying the experimental parameters. The use of this system is then demonstrated for the lithiation/delithiation of silicon nanowires.

Mehdi, Beata L [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Gu, Meng [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Parent, Lucas [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Xu, WU [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Nasybulin, Eduard [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Chen, Xilin [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Unocic, Raymond R [ORNL] [ORNL; Xu, Pinghong [University of California, Davis] [University of California, Davis; Welch, David [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Abellan, Patricia [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Zhang, Ji-Guang [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Liu, Jun [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Wang, Chongmin [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Arslan, Ilke [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Evans, James E [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL); Browning, Nigel [Pacific Northwest National Laboratory (PNNL)] [Pacific Northwest National Laboratory (PNNL)

2014-01-01T23:59:59.000Z

363

Microscopic nature of inhomogeneous line broadening: Analysis of the excitation-line-narrowing spectra of Cf4+ in CeF4  

Science Journals Connector (OSTI)

Optical transitions between 5f states of tetravalent californium ion doped (1 metal-atom %) into CeF4 exhibit unusually large inhomogeneous broadening. The nature of the inhomogeneous broadening in this system has been studied by using fluorescence line narrowing and excitation line narrowing (ELN). It is shown that the energy distributions of different electronic states of Cf4+ in this system are correlated. In the ELN experiments, reduced excitation linewidth was obtained when selectively monitoring fluorescence emission. A linear relation was observed between the excitation energies of crystal-field states of the G4?5 manifold and the fluorescence wavelength monitored across the inhomogeneous profile of a G6?5–F6?7 transition. Analysis of these results by means of a microscopic theory proposed by Laird and Skinner [J. Chem. Phys. 90, 3880 (1989)] has provided insights into the structural properties of this disordered system.

G. K. Liu; Jin Huang; James V. Beitz

1993-11-01T23:59:59.000Z

364

Generation of a spin-polarized electron beam by multipoles magnetic fields  

E-Print Network [OSTI]

The propagation of an electron beam in the presence of transverse magnetic fields possessing integer topological charges is presented. The spin--magnetic interaction introduces a nonuniform spin precession of the electrons that gains a space-variant geometrical phase in the transverse plane proportional to the field's topological charge, whose handedness depends on the input electron's spin state. A combination of our proposed device with an electron orbital angular momentum sorter can be utilized as a spin-filter of electron beams in a mid-energy range. We examine these two different configurations of a partial spin-filter generator numerically. The results of these analysis could prove useful in the design of improved electron microscope.

Ebrahim Karimi; Vincenzo Grillo; Robert W. Boyd; Enrico Santamato

2013-06-10T23:59:59.000Z

365

Reflecting Microscopes  

Science Journals Connector (OSTI)

... at the Physical Society's Exhibition in 1939. I used non-spherical mirror-pairs, Schwarzschild aplanats2,3, for a reason which may prove important if it is desired to ... above 0*2, and should preferably be lower.

C. R. BURCH

1943-12-25T23:59:59.000Z

366

[Inelastic electron scattering from surfaces]. [Annual] progress report  

SciTech Connect (OSTI)

This program is aimed at the quantitative study of surface dynamical processes (vibrational, magnetic excitations) in crystalline slabs, ultrathin-layered materials, and chemisorbed systems on substrates, and of the geometric structure connected to these dynamical excitations. High-resolution electron-energy loss spectroscopy (HREELS) is a powerful probe. Off-specular excitation cross sections are much larger if electron energies are in the LEED range (50-300 eV). The analyses has been used to study surfaces of ordered alloys (NiAl). Ab-initio surface lattice dynamical results were combined with phonon-loss cross sections to achieve a more accurate microscopic description. First-principles phonon eigenvectors and eigenfrequencies were used as inputs to electron-energy-loss multiple scattering cross-section calculations. The combined microscopic approach was used to analyze EELS data of Cu(0001) and Ag(001) at two points. Positron diffraction is discussed as a structural and imaging tool. The relation between geometric structure of a film and its local magnetic properties will be studied in the future, along with other things.

Not Available

1993-10-01T23:59:59.000Z

367

Foil Electron Multiplier  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Foil Electron Multiplier Foil Electron Multiplier Foil Electron Multiplier An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. Available for thumbnail of Feynman Center (505) 665-9090 Email Foil Electron Multiplier An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. The foil thickness enables the incident particles to travel through the foil and continue on

368

Fundamentals of Power Electronics  

Science Journals Connector (OSTI)

This chapter gives a description and overview of power electronic technologies including a description of the fundamental systems that are the building blocks of power electronic systems. Technologies that are de...

Edison R. C. da Silva; Malik E. Elbuluk

2013-01-01T23:59:59.000Z

369

Spectro-microscopic Measurements of Carbonaceous Aerosol Aging in Central California  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Spectro-microscopic Measurements of Carbonaceous Spectro-microscopic Measurements of Carbonaceous Aerosol Aging in Central California For original submission and image(s), see ARM Research Highlights http://www.arm.gov/science/highlights/ Research Highlight Atmospheric aerosols affect climate by scattering and absorbing sunlight and by modifying the properties of clouds. However, there are gaps in our understanding of chemical processes involving these airborne particulates, and these gaps contribute significantly to uncertainties in predicting future climate change. Developing more- accurate global climate models requires a more complete understanding of the aerosol lifecycle, from initial particle formation to loss through incorporation into precipitating clouds or dry deposition. In research published in the journal Atmospheric Chemistry and Physics, a team of

370

Seminar Announcement Nanoscale High Field Chemistry with the Atomic Force Microscope and Patterning January 15, 2009  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

SEMINAR SEMINAR ANNOUNCMENT Thursday, January 15, 2009 11:00am - 12:00 noon EMSL Boardroom Nanoscale High Field Chemistry With the Atomic Force Microscope and Patterning Marco Rolandi Assistant Professor Department of Materials Science and Engineering, University of Washington, Seattle, WA 98195 Facile and affordable processes for the fabrication of nanostructures are fundamental to future endeavors in nanoscale science and engineering. The atomic force microscope was designed primarily for imaging, and has evolved into a versatile tool for nanoscale surface modification. We have developed an AFM based scheme capable of direct writing of glassy carbon nanowires as fast as 1 cm/s. In brief, when a bias is applied across the tip-sample gap a molecular precursor undergoes high field reactions that result in the deposition of a cross- linked product on the surface. In order to gain a

371

Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope  

SciTech Connect (OSTI)

We used a broadband, atomic-force-microscope-based, scanning microwave microscope (SMM) to probe the axial dependence of the charge depletion in a p-n junction within a gallium nitride nanowire (NW). SMM enables the visualization of the p-n junction location without the need to make patterned electrical contacts to the NW. Spatially resolved measurements of S{sub 11}{sup ?}, which is the derivative of the RF reflection coefficient S{sub 11} with respect to voltage, varied strongly when probing axially along the NW and across the p-n junction. The axial variation in S{sub 11}{sup ?}? effectively mapped the asymmetric depletion arising from the doping concentrations on either side of the junction. Furthermore, variation of the probe tip voltage altered the apparent extent of features associated with the p-n junction in S{sub 11}{sup ?} images.

Imtiaz, Atif [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Department of Electrical, Computer, and Energy Engineering, University of Colorado, Boulder, Colorado 80309 (United States); Wallis, Thomas M.; Brubaker, Matt D.; Blanchard, Paul T.; Bertness, Kris A.; Sanford, Norman A.; Kabos, Pavel, E-mail: kabos@boulder.nist.gov [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Weber, Joel C. [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309 (United States); Coakley, Kevin J. [Information Technology Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States)

2014-06-30T23:59:59.000Z

372

Design of a scanning Josephson junction microscope for submicron-resolution magnetic imaging  

SciTech Connect (OSTI)

We describe a magnetic field scanning instrument designed to extend the spatial resolution of scanning superconducting quantum interference device microscopy into the submicron regime. This instrument, the scanning Josephson junction microscope, scans a single Josephson junction across the surface of a sample, detecting the local magnetic field by the modulation of the junction critical current. By using a submicron junction and a scanning tunneling microscope feedback system to maintain close proximity to the surface, magnetic field sensitivity of 10 {mu}G with a spatial resolution of 0.3 {mu}m should be attainable, opening up new opportunities for imaging vortex configurations and core structure in superconductors and magnetic domains in magnetic materials. {copyright} {ital 1999 American Institute of Physics.}

Plourde, B.L.; Van Harlingen, D.J. [Department of Physics, Science and Technology Center for Superconductivity, and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)] [Department of Physics, Science and Technology Center for Superconductivity, and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)

1999-11-01T23:59:59.000Z

373

Macroscopic observables experimentally linked to microscopic processes in the explosive fracture and fragmentation of metals  

SciTech Connect (OSTI)

The response of a metal element to explosive loading depends on a broad spectrum of explosive and metal properties, macroscopic geometry plays a crucial role in defining the localized loading history and the resulting gradients of interest, while microscopic effects and defects are generally believed responsible for damage nucleation. Certain experiments reduce the complexity by producing conditions that are uniform in some sense, allowing dynamic measurement of variables that can be correlated with corresponding microscopic effects observed in recovery experiments. Spherical expansion of thin shells, that eventually fragment, and steady wave loading of flat plates are two such experiments. Proton radiography, x-radiography, laser velocimetry, imaging IR, and visible light photography all have produced dynamic measurements in 4340 steel, copper, uranium alloys, tantalum, and titanium. Correlation of the macroscopic measurements with microscopy on recovered samples has been done with a statistical approach.

Hull, Lawrence M [Los Alamos National Laboratory

2010-12-16T23:59:59.000Z

374

Development of x-ray laminography under an x-ray microscopic condition  

SciTech Connect (OSTI)

An x-ray laminography system under an x-ray microscopic condition was developed to obtain a three-dimensional structure of laterally-extended planar objects which were difficult to observe by x-ray tomography. An x-ray laminography technique was introduced to an x-ray transmission microscope with zone plate optics. Three prototype sample holders were evaluated for x-ray imaging laminography. Layered copper grid sheets were imaged as a laminated sample. Diatomite powder on a silicon nitride membrane was measured to confirm the applicability of this method to non-planar micro-specimens placed on the membrane. The three-dimensional information of diatom shells on the membrane was obtained at a spatial resolution of sub-micron. Images of biological cells on the membrane were also obtained by using a Zernike phase contrast technique.

Hoshino, Masato; Uesugi, Kentaro; Takeuchi, Akihisa; Suzuki, Yoshio; Yagi, Naoto [Japan Synchrotron Radiation Research Institute JASRI/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)

2011-07-15T23:59:59.000Z

375

Neutrinos in the Electron  

E-Print Network [OSTI]

We will show that one half of the rest mass of the electron is equal to the sum of the rest masses of electron neutrinos and that the other half of the rest mass of the electron is given by the energy in the sum of electric oscillations. With this composition we can explain the rest mass, the electric charge, the spin and the magnetic moment of the electron.

E. L. Koschmieder

2006-09-26T23:59:59.000Z

376

Microscopic Scatterer Displacements Generate the 1f Resistance Noise of H in Pd  

Science Journals Connector (OSTI)

The resistance changes generated by individual microscopic displacements due to dissolved hydrogen ions hopping between neighboring sites within palladium films create intense 1f noise at low temperature. Crossover to one-dimensional diffusion-mediated number-fluctuation noise occurs for T?150 K. The measured resistance change per proton displacement is comparable to the resistance per proton as predicted by applicable quantum-interference theories.

Neil M. Zimmerman and Watt W. Webb

1988-08-15T23:59:59.000Z

377

Direct Visualization and Identification of Biofunctionalized Nanoparticles using a Magnetic Atomic Force Microscope  

Science Journals Connector (OSTI)

Because of its outstanding ability to image and manipulate single molecules, atomic force microscopy (AFM) established itself as a fundamental technique in nanobiotechnology. ... force microscope (AFM) has emerged as a powerful tool for exploring the forces and the dynamics of the interaction between individual ligands and receptors, either on isolated mols. ... In CRC Handbook of Chemistry and Physics, 90thed.; Lide, D. R., Eds.; CRC Press Inc.: Boca Raton, FL, 2010; pp 4-142– 4-147. ...

Stephan Block; Gunnar Glo?ckl; Werner Weitschies; Christiane A. Helm

2011-08-05T23:59:59.000Z

378

Dark Energy and Electrons  

E-Print Network [OSTI]

In the light of recent developments in Dark Energy, we consider the electron in a such a background field and show that at the Compton wavelength the electron is stable, in that the Cassini inward pressure exactly counterbalances the outward Coulomb repulsive pressure thus answering a problem of the earlier electron theory.

Burra G. Sidharth

2008-08-05T23:59:59.000Z

379

Continuum-kinetic-microscopic model of lung clearance due to core-annular fluid entrainment  

SciTech Connect (OSTI)

The human lung is protected against aspirated infectious and toxic agents by a thin liquid layer lining the interior of the airways. This airway surface liquid is a bilayer composed of a viscoelastic mucus layer supported by a fluid film known as the periciliary liquid. The viscoelastic behavior of the mucus layer is principally due to long-chain polymers known as mucins. The airway surface liquid is cleared from the lung by ciliary transport, surface tension gradients, and airflow shear forces. This work presents a multiscale model of the effect of airflow shear forces, as exerted by tidal breathing and cough, upon clearance. The composition of the mucus layer is complex and variable in time. To avoid the restrictions imposed by adopting a viscoelastic flow model of limited validity, a multiscale computational model is introduced in which the continuum-level properties of the airway surface liquid are determined by microscopic simulation of long-chain polymers. A bridge between microscopic and continuum levels is constructed through a kinetic-level probability density function describing polymer chain configurations. The overall multiscale framework is especially suited to biological problems due to the flexibility afforded in specifying microscopic constituents, and examining the effects of various constituents upon overall mucus transport at the continuum scale.

Mitran, Sorin, E-mail: mitran@unc.edu

2013-07-01T23:59:59.000Z

380

Microscopic surface structure of C/SiC composite mirrors for space cryogenic telescopes  

E-Print Network [OSTI]

We report on the microscopic surface structure of carbon-fiber-reinforced silicon carbide (C/SiC) composite mirrors that have been improved for the Space Infrared Telescope for Cosmology and Astrophysics (SPICA) and other cooled telescopes. The C/SiC composite consists of carbon fiber, silicon carbide, and residual silicon. Specific microscopic structures are found on the surface of the bare C/SiC mirrors after polishing. These structures are considered to be caused by the different hardness of those materials. The roughness obtained for the bare mirrors is 20 nm rms for flat surfaces and 100 nm rms for curved surfaces. It was confirmed that a SiSiC slurry coating is effective in reducing the roughness to 2 nm rms. The scattering properties of the mirrors were measured at room temperature and also at 95 K. No significant change was found in the scattering properties through cooling, which suggests that the microscopic surface structure is stable with changes in temperature down to cryogenic values. The C/SiC mirror with the SiSiC slurry coating is a promising candidate for the SPICA telescope.

Keigo Enya; Takao Nakagawa; Hidehiro Kaneda; Takashi Onaka; Tuyoshi Ozaki; Masami Kume

2007-07-10T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


381

Enhanced Electron-Phonon Coupling at Metal Surfaces  

SciTech Connect (OSTI)

The Born-Oppenheimer approximation (BOA) decouples electronic from nuclear motion, providing a focal point for most quantum mechanics textbooks. However, a multitude of important chemical, physical and biological phenomena are driven by violations of this approximation. Vibronic interactions are a necessary ingredient in any process that makes or breaks a covalent bond, for example, conventional catalysis or enzymatically delivered biological reactions. Metastable phenomena associated with defects and dopants in semiconductors, oxides, and glasses entail violation of the BOA. Charge exchange in inorganic polymers, organic slats and biological systems involves charge- induced distortions of the local structure. A classic example is conventional superconductivity, which is driven by the electron-lattice interaction. High-resolution angle-resolved photoemission experiments are yielding new insight into the microscopic origin of electron-phonon coupling (EPC) in anisotropic two-dimensional systems. Our recent surface phonon measurement on the surface of a high-Tc material clearly indicates an important momentum dependent EPC in these materials. In the last few years we have shifted our research focus from solely looking at electron phonon coupling to examining the structure/functionality relationship at the surface of complex transition metal compounds. The investigation on electron phonon coupling has allowed us to move to systems where there is coupling between the lattice, the electrons and the spin.

Plummer, Ward E.

2010-08-04T23:59:59.000Z

382

Sensors, Electronics & Instrumentation  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Sensors, Electronics & Instrumentation Sensors, Electronics & Instrumentation Sensors, Electronics & Instrumentation Express Licensing Acoustic Concentration Of Particles In Fluid Flow Express Licensing Apparatus And Method For Hydrogen And Oxygen Mass Spectrometry Of The Terrestrial Magnetosphere Express Licensing Apparatus And Method For Temperature Correction And Expanded Count Rate Of Inorganic Scintillation Detectors Express Licensing Composition and method for removing photoresist materials from electronic components Express Licensing Corrosion Test Cell For Bipolar Plates Express Licensing Cylindrical Acoustic Levitator/Concentrator Negotiable Licensing Electrochemical Apparatus with Disposable and Modifiable Parts Express Licensing Foil electron multiplier Express Licensing Hydrogen Sensor

383

Ultracold Electron Source  

Science Journals Connector (OSTI)

We propose a technique for producing electron bunches that has the potential for advancing the state-of-the-art in brightness of pulsed electron sources by orders of magnitude. In addition, this method leads to femtosecond bunch lengths without the use of ultrafast lasers or magnetic compression. The electron source we propose is an ultracold plasma with electron temperatures down to 10 K, which can be fashioned from a cloud of laser-cooled atoms by photoionization just above threshold. Here we present results of simulations in a realistic setting, showing that an ultracold plasma has an enormous potential as a bright electron source.

B. J. Claessens; S. B. van der Geer; G. Taban; E. J. D. Vredenbregt; O. J. Luiten

2005-10-12T23:59:59.000Z

384

Vehicle Technologies Office: Power Electronics  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Power Electronics to Power Electronics to someone by E-mail Share Vehicle Technologies Office: Power Electronics on Facebook Tweet about Vehicle Technologies Office: Power Electronics on Twitter Bookmark Vehicle Technologies Office: Power Electronics on Google Bookmark Vehicle Technologies Office: Power Electronics on Delicious Rank Vehicle Technologies Office: Power Electronics on Digg Find More places to share Vehicle Technologies Office: Power Electronics on AddThis.com... Just the Basics Hybrid & Vehicle Systems Energy Storage Advanced Power Electronics & Electrical Machines Power Electronics Electrical Machines Thermal Control & System Integration Advanced Combustion Engines Fuels & Lubricants Materials Technologies Power Electronics The power electronics activity focuses on research and development (R&D)

385

Electron Injector Studies at LBL  

E-Print Network [OSTI]

Measurements at the SLC Electron Source", J.Sodja, M.J.great interested in bright electron sources because they areintensity brighter electron sources that the conventional

Kim, C.H.

2010-01-01T23:59:59.000Z

386

Imaging and microanalysis of thin ionomer layers by scanning transmission electron microscopy  

SciTech Connect (OSTI)

Improved conditions for imaging and spectroscopic mapping of thin perfluorosulfonic acid (PFSA) ionomer layers in fuel cell electrodes by scanning transmission electron microscopy (STEM) have been investigated. These conditions are first identified on model systems of Nafion ionomer-coated nanostructured thin films and nanoporous Si. The optimized conditions are then applied in a quantitative study of the ionomer through-layer loading for two typical electrode catalyst coatings using electron energy loss and energy dispersive X-ray spectroscopy in the transmission electron microscope. The e-beam induced damage to the perfluorosulfonic acid (PFSA) ionomer is quantified by following the fluorine mass loss with electron exposure and is then mitigated by a few orders of magnitude using cryogenic specimen cooling and a higher incident electron voltage. Multivariate statistical analysis is also applied to the analysis of spectrum images for data denoising and unbiased separation of independent components related to the catalyst, ionomer, and support.

Cullen, David A [ORNL; Koestner, Roland [General Motors Corporation; Kukreja, Ratan [General Motors Corporation; Minko, Sergiy [Clarkson University, Potsdam, NY; Trotsenko, Oleksandr [Clarkson University, Potsdam, NY; Tokarev, Alexander V [ORNL; Guetaz, Laure [French Atomic Energy Commission (CEA), Grenoble; Meyer III, Harry M [ORNL; Parish, Chad M [ORNL; More, Karren Leslie [ORNL

2014-01-01T23:59:59.000Z

387

Research and Design of a Sample Heater for Beam Line 6-2c Transmission X-ray Microscope  

SciTech Connect (OSTI)

There exists a need for environmental control of samples to be imaged by the Transmission X-Ray Microscope (TXM) at the SSRLs Beam Line 6-2c. In order to observe heat-driven chemical or morphological changes that normally occur in situ, microscopes require an additional component that effectively heats a given sample without heating any of the microscope elements. The confinement of the heat and other concerns about the heaters integrity limit which type of heater is appropriate for the TXM. The bulk of this research project entails researching different heating methods used previously in microscopes, but also in other industrial applications, with the goal of determining the best-fitting method, and finally in designing a preliminary sample heater.

Policht, Veronica; /Loyola U., Chicago /SLAC

2012-08-27T23:59:59.000Z

388

A flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid interface  

E-Print Network [OSTI]

low-noise measurements in ambient, in situ, and electrochemical environments. II. DESIGNA flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid interface, specifically in electrolyte environments. Quantification of system noise limits

Gimzewski, James

389

High Resolution Quantitative Auto-Radiography to determine microscopic distributions of B-10 in neutron capture therapy  

E-Print Network [OSTI]

The success of Boron Neutron Capture Therapy (BNCT) is heavily dependent on the microscopic distribution of B-10 in tissue. High Resolution Quantitative Auto-Radiography (HRQAR) is a potentially valuable analytical tool ...

Harris, Thomas C. (Thomas Cameron)

2006-01-01T23:59:59.000Z

390

Compact scanning soft-x-ray microscope using a laser-produced plasma source and normal-incidence multilayer mirrors  

Science Journals Connector (OSTI)

We have constructed a scanning soft-x-ray microscope that uses a laser-produced plasma as the soft-x-ray source and normal-incidence multilayer-coated mirrors in a Schwarzschild...

Trail, J A; Byer, R L

1989-01-01T23:59:59.000Z

391

Development of the program EOD for design in electron and ion microscopy  

Science Journals Connector (OSTI)

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

J. Zlámal; B. Lencová

2011-01-01T23:59:59.000Z

392

Field emission of electrons from a Cs-doped single carbon nanotube of known chiral indices  

E-Print Network [OSTI]

kV. The diffraction pattern Fig. 1 b was recorded on a charge-coupled device camera with the camera carbon nano- tube. Figure 1 a is a transmission electron microscope TEM image which shows a single carbon determined from the ratios of v/u= 2D2-D1 / 2D1-D2 for each shell, where D1 and D2 are the layer line

Qin, Lu-Chang

393

Electron emitting filaments for electron discharge devices  

DOE Patents [OSTI]

Electrons are copiously emitted by a device comprising a loop-shaped filament made of lanthanum hexaboride. The filament is directly heated by an electrical current produced along the filament by a power supply connected to the terminal legs of the filament. To produce a filament, a diamond saw or the like is used to cut a slice from a bar made of lanthanum hexaboride. The diamond saw is then used to cut the slice into the shape of a loop which may be generally rectangular, U-shaped, hairpin-shaped, zigzag-shaped, or generally circular. The filaments provide high electron emission at a relatively low operating temperature, such as 1600/sup 0/C. To achieve uniform heating, the filament is formed with a cross section which is tapered between the opposite ends of the filament to compensate for nonuniform current distribution along the filament due to the emission of electrons from the filament.

Leung, K.N.; Pincosy, P.A.; Ehlers, K.W.

1983-06-10T23:59:59.000Z

394

Field emission electron source  

DOE Patents [OSTI]

A novel field emitter material, field emission electron source, and commercially feasible fabrication method is described. The inventive field emission electron source produces reliable electron currents of up to 400 mA/cm.sup.2 at 200 volts. The emitter is robust and the current it produces is not sensitive to variability of vacuum or the distance between the emitter tip and the cathode. The novel emitter has a sharp turn-on near 100 volts.

Zettl, Alexander Karlwalter (Kensington, CA); Cohen, Marvin Lou (Berkeley, CA)

2000-01-01T23:59:59.000Z

395

Atomic Level Spatial Variations of Energy States along Graphene Edges  

Science Journals Connector (OSTI)

Atomic Level Spatial Variations of Energy States along Graphene Edges ... The local atomic bonding of carbon atoms around the edge of graphene is examined by aberration-corrected scanning transmission electron microscopy (STEM) combined with electron energy loss spectroscopy (EELS). ... We show that energy states of graphene edges vary across individual atoms along the edge according to their specific C–C bonding, as well as perpendicular to the edge. ...

Jamie H. Warner; Yung-Chang Lin; Kuang He; Masanori Koshino; Kazu Suenaga

2014-10-23T23:59:59.000Z

396

Annual Northern California Electronic  

E-Print Network [OSTI]

HISTORY EXHIBITORS AWARDS The Electronic Materials Symposium is an inter-disciplinary conferencethat. Joseph Benke, Solyndra Ning Cheng Spansion Evan Thrush, Agilent Seongsin Kim, Stanford Junqiao Wu UC

Wu, Junqiao

397

Environment assisted electron capture  

E-Print Network [OSTI]

Electron capture by {\\it isolated} atoms and ions proceeds by photorecombination. In this process a species captures a free electron by emitting a photon which carries away the excess energy. It is shown here that in the presence of an {\\it environment} a competing non-radiative electron capture process can take place due to long range electron correlation. In this interatomic (intermolecular) process the excess energy is transferred to neighboring species. The asymptotic expression for the cross section of this process is derived. We demonstrate by explicit examples that under realizable conditions the cross section of this interatomic process can clearly dominate that of photorecombination.

Kirill Gokhberg; Lorenz S. Cederbaum

2009-11-09T23:59:59.000Z

398

Electronic Transport in Graphene  

Science Journals Connector (OSTI)

This chapter provides an experimental overview of the electrical transport properties of graphene and graphene nanoribbons, focusing on phenomena related to electronics ... and compares the characteristics of exf...

Jun Zhu

2012-01-01T23:59:59.000Z

399

Electronic Waste Transformation  

Science Journals Connector (OSTI)

Electronic Waste Transformation ... Instead, entrepreneurial individuals and small businesses recover valuable metals such as copper from obsolete equipment through activities such as burning. ...

CHERYL HOGUE

2012-04-01T23:59:59.000Z

400

Nuclear radiation electronic gear  

Science Journals Connector (OSTI)

Nuclear radiation electronic gear ... Examines the line of nuclear radiation instrumentation offered by Nuclear-Chicago Corporation and Victoreen Instrument Company. ... Nuclear / Radiochemistry ...

S. Z. Lewin

1961-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


401

Electronic Cooling in Graphene  

Science Journals Connector (OSTI)

Energy transfer to acoustic phonons is the dominant low-temperature cooling channel of electrons in a crystal. For cold neutral graphene we find that the weak cooling power of its acoustic modes relative to their heat capacity leads to a power-law decay of the electronic temperature when far from equilibrium. For heavily doped graphene a high electronic temperature is shown to initially decrease linearly with time at a rate proportional to n3/2 with n being the electronic density. The temperature at which cooling via optical phonon emission begins to dominate depends on graphene carrier density.

R. Bistritzer and A. H. MacDonald

2009-05-21T23:59:59.000Z

402

Electron Microprobe | EMSL  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

from the Hanford Site provide complementary data to ongoing activities in EMSL's microfluidics and Subsurface Flow and Transport capabilities. User Portal Name: Electron...

403

Microscopic structure, discommensurations, and tiling of Si(111)/Cu-‘‘5×5’’  

Science Journals Connector (OSTI)

We derive a detailed, microscopic description of the Si(111)/Cu-‘‘5×5’’ reconstruction. The key to understanding this structure is the x-ray standing-wave determination of the Cu registry with respect to the Si substrate. With Cu basically in H3 and substitutional sites the buckled Si(111) surface bilayer converts to an almost planar, hexagonal Cu2Si layer. The straightened bond angles and the associated increase in the lateral lattice constant give rise to a hexagonal network of discommensurations of period ?5.5aSi. Complete tiling of the surface requires three types of twisted (±3°) domains, two of which are rotationally equivalent.

J. Zegenhagen; E. Fontes; F. Grey; J. R. Patel

1992-07-15T23:59:59.000Z

404

Energy-Dependence of Elastic Alpha-Particle Scattering - Microscopic Model  

E-Print Network [OSTI]

, Cambridge, Massachusetts 02139 (Received 8 June 1972) The energy dependence of elastic n scattering from 4 Ca between 39.6 and 115.4 MeV is determined using a microscopic optical model. The agreement between theory and experi- ment improves as the energy... applied to the scattering of e particles from 40 to 166 MeV' ' ' ' ' and good agreement with experiment has been obtained. Once XV,?has been determined, E(l. (l) can be used to predict the scattering of a particles (in the diffraction region) given a...

Lerner, G. M.; Rutledge, L. L.; Hiebert, John C.; Bernstein, A. M.

1972-01-01T23:59:59.000Z

405

Atomic delocalisation as a microscopic origin of two-level defects in Josephson junctions  

E-Print Network [OSTI]

Identifying the microscopic origins of decoherence sources prevalent in Josephson junction based circuits is central to their use as functional quantum devices. Focussing on so called "strongly coupled" two-level defects, we construct a theoretical model using the atomic position of the oxygen which is spatially delocalised in the oxide forming the Josephson junction barrier. Using this model, we investigate which atomic configurations give rise to two-level behaviour of the type seen in experiments. We compute experimentally observable parameters for phase qubits and examine defect response under the effects of applied electric field and strain.

Timothy C. DuBois; Salvy P. Russo; Jared H. Cole

2014-08-25T23:59:59.000Z

406

Direct photon emission in Heavy Ion Collisions from Microscopic Transport Theory and Fluid Dynamics  

E-Print Network [OSTI]

Direct photon emission in heavy-ion collisions is calculated within a relativistic micro+macro hybrid model and compared to the microscopic transport model UrQMD. In the hybrid approach, the high-density part of the collision is calculated by an ideal 3+1-dimensional hydrodynamic calculation, while the early (pre-equilibrium-) and late (rescattering-) phase are calculated with the transport model. Different scenarios of the transition from the macroscopic description to the transport model description and their effects are studied. The calculations are compared to measurements by the WA98-collaboration and predictions for the future CBM-experiment are made.

Bjoern Baeuchle; Marcus Bleicher

2010-03-29T23:59:59.000Z

407

The Scanning Theremin Microscope: A Model Scanning Probe Instrument for Hands-On Activities  

Science Journals Connector (OSTI)

(9, 10) However, we decided upon a different approach and worked with scanning probe principles to create a large-scale scanning device, the scanning theremin microscope (SThM). ... The simplest mode of scanning is to move the pantograph to scan the probe across the surface at a fixed height, listening for changes in pitch. ... We present a cascade-based computation scheme that has all of the devices and interconnects required for the one-time computation of an arbitrary logic function. ...

Rebecca C. Quardokus; Natalie A. Wasio; S. Alex Kandel

2013-12-20T23:59:59.000Z

408

Scanning electrochemical microscope characterization of thin film combinatorial libraries for fuel cell electrode applications  

Science Journals Connector (OSTI)

Pt–Ru combinatorial libraries of potential fuel cell anode catalysts are formed by sequential sputter deposition through masks onto Si wafers. Scanning electrochemical microscopy (SECM) is employed for characterization of electrocatalytic activity. Aspects of using a scanning electrochemical microscope for characterization of an array of thin film fuel cell electrode materials are discussed. It is shown that in applying SECM to library characterization, careful attention must be paid to thin film annealing, specimen topography and tip degradation in order to realize meaningful results. Results from a Pt–Ru thin film library reveal the most active members near the 50 Pt/50 Ru composition.

M Black; J Cooper; P McGinn

2005-01-01T23:59:59.000Z

409

10-fold detection range increase in quadrant-photodiode position sensing for photonic force microscope  

SciTech Connect (OSTI)

We propose a technique that permits one to increase by one order of magnitude the detection range of position sensing for the photonic force microscope with quadrant photodetectors (QPDs). This technique takes advantage of the unavoidable cross-talk between output signals of the QPD and does not assume that the output signals are linear in the probe displacement. We demonstrate the increase in the detection range from 150 to 1400 nm for a trapped polystyrene sphere with radius of 300 nm as probe.

Perrone, Sandro; Volpe, Giovanni [ICFO-Institut de Ciencies Fotoniques, Mediterranean Technology Park, Castelldefels (Barcelona) 08860 (Spain); Petrov, Dmitri [ICFO-Institut de Ciencies Fotoniques, Mediterranean Technology Park, Castelldefels (Barcelona) 08860 (Spain); Institucio Catalana de Recerca i Estudis Avancats (ICREA), Barcelona 08010 (Spain)

2008-10-15T23:59:59.000Z

410

Microscopic identification of the compensation mechanisms in Si-doped GaAs  

Science Journals Connector (OSTI)

The compensation mechanisms of SiGa donors in GaAs are determined by scanning tunneling microscopy. With increasing Si concentration the SiGa donors are consecutively electrically deactivated by SiAs acceptors, Si clusters, and SiGa-Ga-vacancy complexes. A microscopic model based on the screened Coulomb interaction between charged dopants, the amphoteric nature of Si, and the Fermi-level effect is proposed. It explains the observed defects, the critical Si concentrations of each identified mechanism, and predicts the solubility limit of Si in GaAs. © 1996 The American Physical Society.

C. Domke, Ph. Ebert, M. Heinrich, and K. Urban

1996-10-15T23:59:59.000Z

411

Microscopic study of chiral rotation in odd-odd A $\\sim$ 100 nuclei  

E-Print Network [OSTI]

A systematic study of the doublet bands observed in odd-odd mass $\\sim$ 100 is performed using the microscopic triaxial projected shell model approach. This mass region has depicted some novel features which are not observed in other mass regions, for instance, it has been observed that two chiral bands cross diabatically in $^{106}$Ag. It is demonstrated that this unique feature is due to crossing of the two 2-quasiparticle configurations having different intrinsic structures. Further, we provide a complete set of transition probabilities for all the six-isotopes studied in this work and it is shown that the predicted transitions are in good agreement with the available experimental data.

W. A. Dar; J. A. Sheikh; G. H. Bhat; R. Palit; S. Frauendorf

2013-12-04T23:59:59.000Z

412

Development of x-ray photoelectron microscope with an x-ray laser source  

Science Journals Connector (OSTI)

We have constructed an x-ray photoelectron microscopic system with an x-ray laser as an x-ray source. The lasing line is the Li-like Al 3d-4f transition at 15.47 nm where the recombining Al plasma is used as the x-ray laser medium. The beam from the x-ray laser cavity was then focused by using a Schwarzschild mirror coated with Mo/Si multilayers. The x-ray beam size with a diameter less than 0.5 ?m and the estimated photon number of about 2×10 6 ? photons/shot into the spot were achieved.

Tadayuki Ohchi; Naohiro Yamaguchi; Chiemi Fujikawa; Tamio Hara; Katsumi Watanabe; Ibuki Tanaka; Masami Taguchi

2000-01-01T23:59:59.000Z

413

The Invisible World: Early modern philosophy and the invention of the microscope  

Science Journals Connector (OSTI)

...for its power to lead us to knowledge. Presumably, the more and the better we can see, the more we will know. In this fascinating account of the invisible world opened up by the invention of the microscope, Catherine Wilson suggests that seeing more may not necessarily mean understanding more. Wilson... At the beginning of the Metaphysics, Aristotle exalts sight above the other senses for its power to lead us to knowledge. Presumably, the more and the better we can see, the more we will know. In this fascinating account of the invisible world opened up ...

Pellegrino E.D.

1996-02-08T23:59:59.000Z

414

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electronic Structure and Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print Wednesday, 29 November 2006 00:00 The possibility of using electrons' spins in addition to their charge in information technology has created much enthusiasm for a new field of electronics popularly known as "spintronics." An intensely studied approach to obtaining spin-polarized carriers for data-storage devices is the use of diluted magnetic semiconductors created by doping ions like Mn, Fe, or Co having a net spin into a semiconducting host such as GaAs, ZnO, or GaN. The interaction among these spins leads to ferromagnetic order at low temperatures, which is necessary to create spin-polarized carriers. A research team working at ALS Beamline 4.0.2 and European Synchrotron Radiation Facility Beamline ID8 made a big leap forward in clarifying the microscopic picture of magnetism and anisotropy in Mn-doped GaAs by resolving localized and hybridized d states using angle-dependent x-ray magnetic circular dichroism (XMCD) measurements.

415

Determination of thickness and composition of high-k dielectrics using high-energy electrons  

SciTech Connect (OSTI)

We demonstrate the application of high-energy elastic electron backscattering to the analysis of thin (2–20 nm) HfO{sub 2} overlayers on oxidized Si substrates. The film composition and thickness are determined directly from elastic scattering peaks characteristic of each element. The stoichiometry of the films is determined with an accuracy of 5%–10%. The experimental results are corroborated by medium energy ions scattering and Rutherford backscattering spectrometry measurements, and clearly demonstrate the applicability of the technique for thin-film analysis. Significantly, the presented technique opens new possibilities for nm depth profiling with high spatial resolution in scanning electron microscopes.

Grande, P. L. [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia) [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia); Instituto de Física, Universidade Federal do Rio Grande do Sul, Porto Alegre, RS (Brazil); Vos, M. [Atomic and Molecular Physics Laboratory, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia)] [Atomic and Molecular Physics Laboratory, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia); Venkatachalam, D. K.; Elliman, R. G. [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia)] [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia); Nandi, S. K. [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia) [Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra ACT 0200 (Australia); Research School of Astronomy and Astrophysics, The Australian National University, Canberra ACT 2611 (Australia); Department of Physics, University of Chittagong, Chittagong 4331 (Bangladesh)

2013-08-12T23:59:59.000Z

416

Nano-electron beam induced current and hole charge dynamics through uncapped Ge nanocrystals  

SciTech Connect (OSTI)

Dynamics of hole storage in spherical Ge nanocrystals (NCs) formed by a two step dewetting/nucleation process on an oxide layer grown on an n-doped <001> silicon substrate is studied using a nano-electron beam induced current technique. Carrier generation is produced by an electron beam irradiation. The generated current is collected by an atomic force microscope--tip in contact mode at a fixed position away from the beam spot of about 0.5 {mu}m. This distance represents the effective diffusion length of holes. The time constants of holes charging are determined and the effect of the NC size is underlined.

Marchand, A.; El Hdiy, A.; Troyon, M. [Laboratoire de Recherche en Nanosciences, Bat. 6, case no 15, UFR Sciences, Universite de Reims Champagne Ardenne, 51687 Reims Cedex 2 (France); Amiard, G.; Ronda, A.; Berbezier, I. [IM2NP, Faculte des Sciences et Techniques, Campus de Saint Jerome - Case 142, Avenue Escadrille Normandie Niemen, 13397 Marseille Cedex 20 (France)

2012-04-16T23:59:59.000Z

417

Controlling Graphene's Electronic Structure  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Controlling Graphene's Electronic Structure Print Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's electrical charge carriers (electrons and holes) move through a solid with effectively zero mass and constant velocity, like photons. Graphene's intrinsically low scattering rate from defects implies the possibility of a new kind of electronics based on the manipulation of electrons as waves rather than particles. The primary technical difficulty has been controlling the transport of electrical charge carriers through the sheet. This area of research is known as bandgap engineering. While bandgap engineering is the basis of semiconductor technology, it is only now being applied to graphene. Using angle-resolved photoemission spectroscopy (ARPES) at ALS Beamline 7.0.1, a team of scientists from the ALS and Germany characterized the electronic band structure and successfully controlled the gap between valence and conduction bands in a bilayer of graphene thin films deposited on a substrate of silicon carbide. This was done by doping one sheet with adsorbed potassium atoms, creating an asymmetry between the two layers.

418

Electronic Mail Analysis Capability  

Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

Establishes the pilot program to test the Department of Energy (DOE) Electronic Mail Analysis Capability (EMAC), which will be used to monitor and analyze outgoing and incoming electronic mail (e-mail) from the National Nuclear Security Administration (NNSA) and DOE laboratories that are engaged in nuclear weapons design or work involving special nuclear material. No cancellation.

2001-01-08T23:59:59.000Z

419

A near-field scanning microwave microscope based on a superconducting resonator for low power measurements  

E-Print Network [OSTI]

We report on the design and performance of a cryogenic (300 mK) near-field scanning microwave microscope. It uses a microwave resonator as the near-field sensor, operating at a frequency of 6 GHz and microwave probing amplitudes down to 100 uV, approaching low enough photon population (N~1000) of the resonator such that coherent quantum manipulation becomes feasible. The resonator is made out of a miniaturized distributed fractal superconducting circuit that is integrated with the probing tip, micromachined to be compact enough such that it can be mounted directly on a quartz tuning-fork, and used for parallel operation as an atomic force microscope (AFM). The resonator is magnetically coupled to a transmission line for readout, and to achieve enhanced sensitivity we employ a Pound-Drever-Hall measurement scheme to lock to the resonance frequency. We achieve a well localized near-field around the tip such that the microwave resolution is comparable to the AFM resolution, and a capacitive sensitivity down to 6.4x10^-20 F/rtHz, limited by mechanical noise. We believe that the results presented here are a significant step towards probing quantum systems at the nanoscale using near-field scanning microwave microscopy.

S. E. de Graaf; A. V. Danilov; A. Adamyan; S. E. Kubatkin

2014-04-02T23:59:59.000Z

420

Measuring Boltzmann’s constant with a low-cost atomic force microscope: An undergraduate experiment  

Science Journals Connector (OSTI)

We discuss a low-cost atomic force microscope that we have designed and built for use in an undergraduate teaching laboratory. This microscope gives students hands-on access to nano-Newton force measurements and subangstrom position measurements. The apparatus relies mainly on off-the-shelf components and utilizes an interferometric position sensor known as the interdigitated (ID) cantilever to obtain high resolution. The mechanical properties of the ID readout enable a robust and open design that makes it possible for students to directly control it. Its pedagogical advantage is that students interact with a complete instrument system and learn measurement principles in context. One undergraduate experiment enabled by this apparatus is a measurement of Boltzmann’s constant which is done by recording the thermal noise power spectrum of a microfabricated cantilever beam. In addition to gaining an appreciation of the lower limits of position and force measurements students learn to apply numerous concepts such as digital sampling Fourier-domain analysis noise sources and error propagation.

M. Shusteff; T. P. Burg; S. R. Manalis

2006-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


421

Integration of an Atomic Force Microscope in a Beamline Sample Environment  

SciTech Connect (OSTI)

We developed and optimised an optics-free Atomic Force Microscope (AFM) that can be directly installed on most of the synchrotron radiation end-stations. The combination of Scanning Probe Microscopies with X-ray microbeams adds new possibilities to the variety of synchrotron radiation techniques. The instrument can be used for atomic force imaging of the investigated sample or to locally measure the X-ray absorption or diffraction, or it can also be used to mechanically interact with the sample while simultaneously taking spectroscopy or diffraction measurements. The local character of these measurements is intrinsically linked with the use of the Atomic Force Microscope tip. It is the sharpness of the tip that gives the opportunity to measure the photons flux impinging on it giving beam position monitor features, or allows to locally measure the absorption coefficient or the shape of the diffraction pattern. As an example of the possibilities opened by the instrument we will show diffraction measurements performed on a Ge/Si island while being indented with the AFM tip providing local measure of the Young coefficient. Three ESRF beamlines are going to be equipped with this new instrument.

Rodrigues, M. S.; Hrouzek, M.; Dhez, O.; Comin, F. [ESRF, 6 rue Horowitz 38042 Grenoble Cedex (France); Chevrier, J. [Institut Neel-CNRS and Universite Joseph Fourier, 38042 Grenoble (France)

2010-06-23T23:59:59.000Z

422

The Circular Unitary Ensemble and the Riemann zeta function: the microscopic landscape  

E-Print Network [OSTI]

We show in this paper that after proper scalings, the characteristic polynomial of a random unitary matrix converges almost surely to a random analytic function whose zeros, which are on the real line, form a determinantal point process with sine kernel. Our scaling is performed at the so-called "microscopic" level, that is we consider the characteristic polynomial at points which are of order $1/n$ distant. We draw several consequences from our result. On the random matrix theory side, we obtain the limiting distribution for ratios of characteristic polynomials where the points are evaluated at points of the form $\\exp(2 i \\pi \\alpha/n)$. We also give an explicit expression for the (dependence) relation between two different values of the characteristic polynomial on the microscopic scale. On the number theory side, inspired by the Keating-Snaith philosophy, we conjecture some new limit theorems for the Riemann zeta function at the stochastic process level as well as some alternative approach to the conjecture by Goldston, Montgomery and Gonek for the moments of the logarithmic derivative of the Riemann zeta function. We prove our main random matrix theory result in the framework of virtual isometries to circumvent the fact that the rescaled characteristic polynomial does not even have a moment of order one, hence making the classical techniques of random matrix theory difficult to apply.

Reda Chhaibi; Joseph Najnudel; Ashkan Nikeghbali

2014-10-06T23:59:59.000Z

423

A near-field scanning microwave microscope based on a superconducting resonator for low power measurements  

E-Print Network [OSTI]

We report on the design and performance of a cryogenic (300 mK) near-field scanning microwave microscope. It uses a microwave resonator as the near-field sensor, operating at a frequency of 6 GHz and microwave probing amplitudes down to 100 uV, approaching low enough photon population (N~1000) of the resonator such that coherent quantum manipulation becomes feasible. The resonator is made out of a miniaturized distributed fractal superconducting circuit that is integrated with the probing tip, micromachined to be compact enough such that it can be mounted directly on a quartz tuning-fork, and used for parallel operation as an atomic force microscope (AFM). The resonator is magnetically coupled to a transmission line for readout, and to achieve enhanced sensitivity we employ a Pound-Drever-Hall measurement scheme to lock to the resonance frequency. We achieve a well localized near-field around the tip such that the microwave resolution is comparable to the AFM resolution, and a capacitive sensitivity down to 6...

de Graaf, S E; Adamyan, A; Kubatkin, S E

2014-01-01T23:59:59.000Z

424

Electronic Reading Room  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electronic Reading Room - making information about the Freedom of Information Act (FOIA) and Privacy Act process accessible to the public electronically. Electronic Reading Room - making information about the Freedom of Information Act (FOIA) and Privacy Act process accessible to the public electronically. Major Information Systems - Final Opinions - [5 USC 552 (a)(2)](A) final opinions, including concurring and dissenting opinions, as well as orders, made in the adjudication of cases within the Office of Hearings and Appeals Statements of Policy and Interpretation and Administrative Staff Manuals and Instructions - [5 USC 552 (a)(2)](B) those statements of policy and interpretation which have been adopted by the agency and are not published in the Federal Register - Directives, DOE Orders, Headquarters Orders, Secretarial Notices, Technical Standards, Forms, Delegations, Electronic Library Public Reading Facilities - making information available for public inspection and copying

425

Electrons and Mirror Symmetry  

SciTech Connect (OSTI)

The neutral weak force between an electron and a target particle, mediated by the Z boson, can be isolated by measuring the fractional change under a mirror reflection of the scattering probability of relativistic longitudinally polarized electrons off unpolarized targets. This technique yields neutral weak force measurements at a length scale of 1 femtometer, in contrast to high energy collider measurements that probe much smaller length scales. Study of the variation of the weak force over a range of length scales provides a stringent test of theory, complementing collider measurements. We describe a recent measurement of the neutral weak force between two electrons by the E158 experiment at the Stanford Linear Accelerator Center. While the weak force between an electron and positron has been extensively studied, that between two electrons had never directly been measured. We conclude by discussing prospects for even more precise measurements at future facilities.

Kumar, Krishna (University of Massachusetts, Amherst) [University of Massachusetts, Amherst

2007-04-04T23:59:59.000Z

426

Laboratory-Based Cryogenic Soft X-ray Tomography with Correlative Cryo-Light and Electron Microscopy  

SciTech Connect (OSTI)

Here we present a novel laboratory-based cryogenic soft X-ray microscope for whole cell tomography of frozen hydrated samples. We demonstrate the capabilities of this compact cryogenic microscope by visualizing internal sub-cellular structures of Saccharomyces cerevisiae cells. The microscope is shown to achieve better than 50 nm spatial resolution with a Siemens star test sample. For whole biological cells, the microscope can image specimens up to 5 micrometers thick. Structures as small as 90 nm can be detected in tomographic reconstructions at roughly 70 nm spatial resolution following a low cumulative radiation dose of only 7.2 MGy. Furthermore, the design of the specimen chamber utilizes a standard sample support that permits multimodal correlative imaging of the exact same unstained yeast cell via cryo-fluorescence light microscopy, cryo-soft x-ray microscopy and cryo-transmission electron microscopy. This completely laboratory-based cryogenic soft x-ray microscope will therefore enable greater access to three-dimensional ultrastructure determination of biological whole cells without chemical fixation or physical sectioning.

Carlson, David B.; Gelb, Jeff; Palshin, Vadim; Evans, James E.

2013-02-01T23:59:59.000Z

427

Angle-Resolved Photoemission Spectroscopy on Electronic Structure and Electron-Phonon Coupling in Cuprate Superconductors  

SciTech Connect (OSTI)

In addition to the record high superconducting transition temperature (T{sub c}), high temperature cuprate superconductors are characterized by their unusual superconducting properties below T{sub c}, and anomalous normal state properties above T{sub c}. In the superconducting state, although it has long been realized that superconductivity still involves Cooper pairs, as in the traditional BCS theory, the experimentally determined d-wave pairing is different from the usual s-wave pairing found in conventional superconductors. The identification of the pairing mechanism in cuprate superconductors remains an outstanding issue. The normal state properties, particularly in the underdoped region, have been found to be at odd with conventional metals which is usually described by Fermi liquid theory; instead, the normal state at optimal doping fits better with the marginal Fermi liquid phenomenology. Most notable is the observation of the pseudogap state in the underdoped region above T{sub c}. As in other strongly correlated electrons systems, these unusual properties stem from the interplay between electronic, magnetic, lattice and orbital degrees of freedom. Understanding the microscopic process involved in these materials and the interaction of electrons with other entities is essential to understand the mechanism of high temperature superconductivity. Since the discovery of high-T{sub c} superconductivity in cuprates, angle-resolved photoemission spectroscopy (ARPES) has provided key experimental insights in revealing the electronic structure of high temperature superconductors. These include, among others, the earliest identification of dispersion and a large Fermi surface, an anisotropic superconducting gap suggestive of a d-wave order parameter, and an observation of the pseudogap in underdoped samples. In the mean time, this technique itself has experienced a dramatic improvement in its energy and momentum resolutions, leading to a series of new discoveries not thought possible only a decade ago. This revolution of the ARPES technique and its scientific impact result from dramatic advances in four essential components: instrumental resolution and efficiency, sample manipulation, high quality samples and well-matched scientific issues. The purpose of this treatise is to go through the prominent results obtained from ARPES on cuprate superconductors. Because there have been a number of recent reviews on the electronic structures of high-T{sub c} materials, we will mainly present the latest results not covered previously, with a special attention given on the electron-phonon interaction in cuprate superconductors. What has emerged is rich information about the anomalous electron-phonon interaction well beyond the traditional views of the subject. It exhibits strong doping, momentum and phonon symmetry dependence, and shows complex interplay with the strong electron-electron interaction in these materials. ARPES experiments have been instrumental in identifying the electronic structure, observing and detailing the electron-phonon mode coupling behavior, and mapping the doping evolution of the high-T{sub c} cuprates. The spectra evolve from the strongly coupled, polaronic spectra seen in underdoped cuprates to the Migdal-Eliashberg like spectra seen in the optimally and overdoped cuprates. In addition to the marked doping dependence, the cuprates exhibit pronounced anisotropy with direction in the Brillouin zone: sharp quasiparticles along the nodal direction that broaden significantly in the anti-nodal region of the underdoped cuprates, an anisotropic electron-phonon coupling vertex for particular modes identified in the optimal and overdoped compounds, and preferential scattering across the two parallel pieces of Fermi surface in the antinodal region for all doping levels. This also contributes to the pseudogap effect. To the extent that the Migdal-Eliashberg picture applies, the spectra of the cuprates bear resemblance to that seen in established strongly coupled electron-phonon superconductors such as Pb. On the other

Zhou, X.J.

2010-04-30T23:59:59.000Z

428

Precision shape modification of nanodevices with a low-energy electron beam  

DOE Patents [OSTI]

Methods of shape modifying a nanodevice by contacting it with a low-energy focused electron beam are disclosed here. In one embodiment, a nanodevice may be permanently reformed to a different geometry through an application of a deforming force and a low-energy focused electron beam. With the addition of an assist gas, material may be removed from the nanodevice through application of the low-energy focused electron beam. The independent methods of shape modification and material removal may be used either individually or simultaneously. Precision cuts with accuracies as high as 10 nm may be achieved through the use of precision low-energy Scanning Electron Microscope scan beams. These methods may be used in an automated system to produce nanodevices of very precise dimensions. These methods may be used to produce nanodevices of carbon-based, silicon-based, or other compositions by varying the assist gas.

Zettl, Alex (Kensington, CA); Yuzvinsky, Thomas David (Berkeley, CA); Fennimore, Adam (Berkeley, CA)

2010-03-09T23:59:59.000Z

429

Markov Random Field Based Automatic Image Alignment for ElectronTomography  

SciTech Connect (OSTI)

Cryo electron tomography (cryo-ET) is the primary method for obtaining 3D reconstructions of intact bacteria, viruses, and complex molecular machines ([7],[2]). It first flash freezes a specimen in a thin layer of ice, and then rotates the ice sheet in a transmission electron microscope (TEM) recording images of different projections through the sample. The resulting images are aligned and then back projected to form the desired 3-D model. The typical resolution of biological electron microscope is on the order of 1 nm per pixel which means that small imprecision in the microscope's stage or lenses can cause large alignment errors. To enable a high precision alignment, biologists add a small number of spherical gold beads to the sample before it is frozen. These beads generate high contrast dots in the image that can be tracked across projections. Each gold bead can be seen as a marker with a fixed location in 3D, which provides the reference points to bring all the images to a common frame as in the classical structure from motion problem. A high accuracy alignment is critical to obtain a high resolution tomogram (usually on the order of 5-15nm resolution). While some methods try to automate the task of tracking markers and aligning the images ([8],[4]), they require user intervention if the SNR of the image becomes too low. Unfortunately, cryogenic electron tomography (or cryo-ET) often has poor SNR, since the samples are relatively thick (for TEM) and the restricted electron dose usually results in projections with SNR under 0 dB. This paper shows that formulating this problem as a most-likely estimation task yields an approach that is able to automatically align with high precision cryo-ET datasets using inference in graphical models. This approach has been packaged into a publicly available software called RAPTOR-Robust Alignment and Projection estimation for Tomographic Reconstruction.

Moussavi, Farshid; Amat, Fernando; Comolli, Luis R.; Elidan, Gal; Downing, Kenneth H.; Horowitz, Mark

2007-11-30T23:59:59.000Z

430

Electron Diffraction from a Cold Atom Electron Source  

Science Journals Connector (OSTI)

We present single-shot nanosecond and picosecond electron diffraction measurements from gold and graphene using ultracold electrons generated by photoionisation of laser cooled atoms.

Speirs, Rory W; Thompson, Daniel J; Murphy, Dene; Sparkes, Ben M; Scholten, Rob E

431

electronic reprint Synchrotron  

E-Print Network [OSTI]

electronic reprint Journal of Synchrotron Radiation ISSN 0909-0495 Editor: G. Ice Accurate dose required to produce a defined outcome, following the Grotthuss­Draper law (King & Laidler, 1984

Hitchcock, Adam P.

432

Electrons from Muon Capture  

Science Journals Connector (OSTI)

We have searched for the process ?-+p?p+e- or ?-+n?n+e- for ? mesons stopped in a Cu target. Scintillation counters were employed to detect the electrons from the process. No counts attributable to the electrons were obtained and we place an upper limit of ?5×10-4 for the relative rate of this process to that for the usual nuclear capture reaction.

J. Steinberger and Harry B. Wolfe

1955-12-01T23:59:59.000Z

433

Hyperspectral microscope for in vivo imaging of microstructures and cells in tissues  

DOE Patents [OSTI]

An optical hyperspectral/multimodal imaging method and apparatus is utilized to provide high signal sensitivity for implementation of various optical imaging approaches. Such a system utilizes long working distance microscope objectives so as to enable off-axis illumination of predetermined tissue thereby allowing for excitation at any optical wavelength, simplifies design, reduces required optical elements, significantly reduces spectral noise from the optical elements and allows for fast image acquisition enabling high quality imaging in-vivo. Such a technology provides a means of detecting disease at the single cell level such as cancer, precancer, ischemic, traumatic or other type of injury, infection, or other diseases or conditions causing alterations in cells and tissue micro structures.

Demos; Stavros G. (Livermore, CA)

2011-05-17T23:59:59.000Z

434

Hybrid methods for witnessing entanglement in a microscopic-macroscopic system  

SciTech Connect (OSTI)

We propose a hybrid approach to the experimental assessment of the genuine quantum features of a general system consisting of microscopic and macroscopic parts. We infer entanglement by combining dichotomic measurements on a bidimensional system and phase-space inference through the Wigner distribution associated with the macroscopic component of the state. As a benchmark, we investigate the feasibility of our proposal in a bipartite-entangled state composed of a single-photon and a multiphoton field. Our analysis shows that, under ideal conditions, maximal violation of a Clauser-Horne-Shimony-Holt-based inequality is achievable regardless of the number of photons in the macroscopic part of the state. The difficulty in observing entanglement when losses and detection inefficiency are included can be overcome by using a hybrid entanglement witness that allows efficient correction for losses in the few-photon regime.

Spagnolo, Nicolo [Dipartimento di Fisica, Sapienza Universita di Roma, Piazzale Aldo Moro 5, I-00185 Roma (Italy); Consorzio Nazionale Interuniversitario per le Scienze Fisiche della Materia, Piazzale Aldo Moro 5, I-00185 Roma (Italy); Vitelli, Chiara [Dipartimento di Fisica, Sapienza Universita di Roma, Piazzale Aldo Moro 5, I-00185 Roma (Italy); Paternostro, Mauro [School of Mathematics and Physics, Queen's University, BT 7 1NN Belfast (United Kingdom); De Martini, Francesco [Dipartimento di Fisica, Sapienza Universita di Roma, Piazzale Aldo Moro 5, I-00185 Roma (Italy); Accademia Nazionale dei Lincei, via della Lungara 10, I-00165 Roma (Italy); Sciarrino, Fabio [Dipartimento di Fisica, Sapienza Universita di Roma, Piazzale Aldo Moro 5, I-00185 Roma (Italy); Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche (INO-CNR), largo E. Fermi 6, I-50125 Firenze (Italy)

2011-09-15T23:59:59.000Z

435

Selective nano-patterning of graphene using a heated atomic force microscope tip  

SciTech Connect (OSTI)

In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 ?m/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO{sub 2} layer, with a tip contact force of 100 nN.

Choi, Young-Soo; Wu, Xuan; Lee, Dong-Weon, E-mail: mems@jnu.ac.kr [MEMS and Nanotechnology Laboratory, School of Mechanical Engineering, Chonnam National University, Gwangju (Korea, Republic of)] [MEMS and Nanotechnology Laboratory, School of Mechanical Engineering, Chonnam National University, Gwangju (Korea, Republic of)

2014-04-15T23:59:59.000Z

436

Microscopic Description of Entanglements in Polyethylene Networks and Melts: Strong, Weak, Pairwise, and Collective Attributes  

E-Print Network [OSTI]

We present atomistic molecular dynamics simulations of two Polyethylene systems where all entanglements are trapped: a perfect network, and a melt with grafted chain ends. We examine microscopically at what level topological constraints can be considered as a collective entanglement effect, as in tube model theories, or as certain pairwise uncrossability interactions, as in slip-link models. A pairwise parameter, which varies between these limiting cases, shows that, for the systems studied, the character of the entanglement environment is more pairwise than collective. We employ a novel methodology, which analyzes entanglement constraints into a complete set of pairwise interactions, similar to slip links. Entanglement confinement is assembled by a plethora of links, with a spectrum of confinement strengths, from strong to weak. The strength of interactions is quantified through a link `persistence', which is the fraction of time for which the links are active. By weighting links according to their strength,...

Anogiannakis, Stefanos D; Theodorou, Doros N

2012-01-01T23:59:59.000Z

437

Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode  

E-Print Network [OSTI]

A method is described intended for distributed calibration of a probe microscope scanner consisting in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each point of the movement space of the scanner can be defined by a unique set of scale factors. Feature-oriented scanning (FOS) methodology is used to implement the distributed calibration, which permits to exclude in situ the negative influence of thermal drift, creep and hysteresis on the obtained results. The sensitivity of LCCs to errors in determination of position coordinates of surface features forming the local calibration structure (LCS) is eliminated by performing multiple repeated measurements followed by building regression surfaces. There are no principle restrictions on the number of repeated LCS measurements. Possessing the calibration database enables correcting in one procedure all the spatial distortions caused by nonlinearity, nonorthogonality and spurious cro...

Lapshin, Rostislav V

2015-01-01T23:59:59.000Z

438

Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description  

E-Print Network [OSTI]

A method is described intended for distributed calibration of a probe microscope scanner consisting in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each point of the movement space of the scanner can be defined by a unique set of scale factors. Feature-oriented scanning (FOS) methodology is used to implement the distributed calibration, which permits to exclude in situ the negative influence of thermal drift, creep and hysteresis on the obtained results. The sensitivity of LCCs to errors in determination of position coordinates of surface features forming the local calibration structure (LCS) is eliminated by performing multiple repeated measurements followed by building regression surfaces. There are no principle restrictions on the number of repeated LCS measurements. Possessing the calibration database enables correcting in one procedure all the spatial distortions caused by nonlinearity, nonorthogonality and spurious cro...

Lapshin, Rostislav V

2015-01-01T23:59:59.000Z

439

Calculation of the microscopic parameters of a self-induced transparency modelocked quantum cascade laser  

Science Journals Connector (OSTI)

A model to calculate the microscopic parameters of self-induced transparency (SIT) modelocked quantum cascade lasers (QCLs) is presented and the parameters are then calculated for a particular structure. These parameters are then used to calculate the gain to absorption ratio that is required to determine the required ratio of gain periods to absorbing periods that must be grown in order to obtain stable modelocked pulses. The modelocked pulse parameters, along with the stability limits are then calculated as the ratio of gain to absorption varies. For the SIT modelocked QCL design that we examined, we found that three to five gain periods must be grown for each absorbing period in order to ensure stable operation.

Muhammad Anisuzzaman Talukder; Curtis R. Menyuk

2013-01-01T23:59:59.000Z

440

Interacting dark energy: the role of microscopic feedback in the dark sector  

E-Print Network [OSTI]

We investigate the impact on the classical dynamics of dark matter particles and dark energy of a non-minimal coupling in the dark sector, assuming that the mass of the dark matter particles is coupled to a dark energy scalar field. We show that standard results can only be recovered if the space-time variation of the dark energy scalar field is sufficiently smooth on the characteristic length scale of the dark matter particles, and we determine the associated constraint dependent on both the mass and radius of the dark matter particles and the coupling to the dark energy scalar field. We further show, using field theory numerical simulations, that a violation of such constraint results in a microscopic feedback effect strongly affecting the dynamics of dark matter particles, with a potential impact on structure formation and on the space-time evolution of the dark energy equation of state.

Avelino, P P

2015-01-01T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


441

Two-neutron correlations in microscopic wave functions of He-6, He-8 and C-12  

E-Print Network [OSTI]

Two-neutron densities obtained from microscopic wave functions of $^6$He and $^8$He are investigated to reveal di-neutron correlations. In particular, the comparison of the two-neutron density with the product of one-neutron densities is useful for a quantitative discussion of di-neutron correlations. The calculations show that the S=0 spatial two-neutron correlation increases at the surface of $^6$He$(0^+_1)$ and $^8$He$(0^+_2)$. The enhancement is remarkable in the $^6$He$(0^+_1)$ ground state but not as prominent in the $^8$He$(0^+_1)$ ground state. Configuration mixing of many Slater determinants is essential to describe the di-neutron correlations. Two-neutron densities in $^{12}$C wave functions with $\\alpha$-cluster structures are also studied.

Yoshiko Kanada-En'yo; Hans Feldmeier; Tadahiro Suhara

2011-07-28T23:59:59.000Z

442

Construction of a Dilution Refrigerator Based Ultra-Low Temperature Scanning Tunneling Microscope  

Science Journals Connector (OSTI)

We constructed a dilution refrigerator based ultra-low temperature scanning tunneling microscope (ULT-STM) which works at temperatures down to 20 mK, in magnetic fields up to 6 T and in ultrahigh vacuum (UHV). One can load samples/tips, which are prepared in a UHV chamber, to an STM head maintaining the low temperature and UHV conditions. After then they can be cooled back to the base temperature in several hours. We report results of a test measurement on a superconducting NbSe2 sample as well as recent STM/STS studies on graphite samples such as observations of the Landau quantization and visualization of the possible localized states in magnetic fields.

Hiroshi Kambara; Tomohiro Matsui; Yasuhiro Niimi; Hiroshi Fukuyama

2006-01-01T23:59:59.000Z

443

Laser apparatus and method for microscopic and spectroscopic analysis and processing of biological cells  

DOE Patents [OSTI]

An apparatus and method for microscopic and spectroscopic analysis and processing of biological cells. The apparatus comprises a laser having an analysis region within the laser cavity for containing one or more biological cells to be analyzed. The presence of a cell within the analysis region in superposition with an activated portion of a gain medium of the laser acts to encode information about the cell upon the laser beam, the cell information being recoverable by an analysis means that preferably includes an array photodetector such as a CCD camera and a spectrometer. The apparatus and method may be used to analyze biomedical cells including blood cells and the like, and may include processing means for manipulating, sorting, or eradicating cells after analysis thereof.

Gourley, Paul L. (12508 Loyola, NE., Albuquerque, NM 87112); Gourley, Mark F. (7509 Spring Lake Dr., Apt. B1, Bethesda, MD 20817)

1997-01-01T23:59:59.000Z

444

Laser apparatus and method for microscopic and spectroscopic analysis and processing of biological cells  

DOE Patents [OSTI]

An apparatus and method are disclosed for microscopic and spectroscopic analysis and processing of biological cells. The apparatus comprises a laser having an analysis region within the laser cavity for containing one or more biological cells to be analyzed. The presence of a cell within the analysis region in superposition with an activated portion of a gain medium of the laser acts to encode information about the cell upon the laser beam, the cell information being recoverable by an analysis means that preferably includes an array photodetector such as a CCD camera and a spectrometer. The apparatus and method may be used to analyze biomedical cells including blood cells and the like, and may include processing means for manipulating, sorting, or eradicating cells after analysis. 20 figs.

Gourley, P.L.; Gourley, M.F.

1997-03-04T23:59:59.000Z

445

Analytical Model for Rates of Electron Attachment and Intramolecular Electron Transfer in Electron Transfer  

E-Print Network [OSTI]

. As a result, in ECD the primary source of excess energy is the recombination energy released when the electronAnalytical Model for Rates of Electron Attachment and Intramolecular Electron Transfer in Electron-mail: simons@chem.utah.edu Abstract: A new physical model is put forth to allow the prediction of electron

Simons, Jack

446

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print The possibility of using electrons' spins in addition to their charge in information technology has created much enthusiasm for a new field of electronics popularly known as "spintronics." An intensely studied approach to obtaining spin-polarized carriers for data-storage devices is the use of diluted magnetic semiconductors created by doping ions like Mn, Fe, or Co having a net spin into a semiconducting host such as GaAs, ZnO, or GaN. The interaction among these spins leads to ferromagnetic order at low temperatures, which is necessary to create spin-polarized carriers. A research team working at ALS Beamline 4.0.2 and European Synchrotron Radiation Facility Beamline ID8 made a big leap forward in clarifying the microscopic picture of magnetism and anisotropy in Mn-doped GaAs by resolving localized and hybridized d states using angle-dependent x-ray magnetic circular dichroism (XMCD) measurements.

447

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print Electronic Structure and Magnetism in Diluted Magnetic Semiconductors Print The possibility of using electrons' spins in addition to their charge in information technology has created much enthusiasm for a new field of electronics popularly known as "spintronics." An intensely studied approach to obtaining spin-polarized carriers for data-storage devices is the use of diluted magnetic semiconductors created by doping ions like Mn, Fe, or Co having a net spin into a semiconducting host such as GaAs, ZnO, or GaN. The interaction among these spins leads to ferromagnetic order at low temperatures, which is necessary to create spin-polarized carriers. A research team working at ALS Beamline 4.0.2 and European Synchrotron Radiation Facility Beamline ID8 made a big leap forward in clarifying the microscopic picture of magnetism and anisotropy in Mn-doped GaAs by resolving localized and hybridized d states using angle-dependent x-ray magnetic circular dichroism (XMCD) measurements.

448

Reversible Hydrogen Storage Materials – Structure, Chemistry, and Electronic Structure  

SciTech Connect (OSTI)

To understand the processes involved in the uptake and release of hydrogen from candidate light-weight metal hydride storage systems, a combination of materials characterization techniques and first principle calculation methods have been employed. In addition to conventional microstructural characterization in the transmission electron microscope, which provides projected information about the through thickness microstructure, electron tomography methods were employed to determine the three-dimensional spatial distribution of catalyst species for select systems both before and after dehydrogenation. Catalyst species identification as well as compositional analysis of the storage material before and after hydrogen charging and discharging was performed using a combination of energy dispersive spectroscopy, EDS, and electron energy loss spectroscopy, EELS. The characterization effort was coupled with first-principles, electronic-structure and thermodynamic techniques to predict and assess meta-stable and stable phases, reaction pathways, and thermodynamic and kinetic barriers. Systems studied included:NaAlH4, CaH2/CaB6 and Ca(BH4)2, MgH2/MgB2, Ni-Catalyzed Magnesium Hydride, TiH2-Catalyzed Magnesium Hydride, LiBH4, Aluminum-based systems and Aluminum

Robertson, Ian M. [University of Wisconsin-Madison; Johnson, Duane D. [Ames Lab., Iowa

2014-06-21T23:59:59.000Z

449

Electronic Structure of Multilayer Graphene  

Science Journals Connector (OSTI)

......Articles Electronic Structure of Multilayer Graphene Hongki Min *) Allan H. MacDonald Department...the electronic structure of multilayer graphene using a pi-orbital continuum model...electronic structure of arbitrarily stacked graphene multilayers consists of chiral pseudospin......

Hongki Min; Allan H. MacDonald

2008-06-01T23:59:59.000Z

450

Free electron laser  

DOE Patents [OSTI]

A high gain, single-pass free electron laser formed of a high brilliance electron injector source, a linear accelerator which imparts high energy to the electron beam, and an undulator capable of extremely high magnetic fields, yet with a very short period. The electron injector source is the first stage (gap) of the linear accelerator or a radial line transformer driven by fast circular switch. The linear accelerator is formed of a plurality of accelerating gaps arranged in series. These gaps are energized in sequence by releasing a single pulse of energy which propagates simultaneously along a plurality of transmission lines, each of which feeds the gaps. The transmission lines are graduated in length so that pulse power is present at each gap as the accelerated electrons pass therethrough. The transmission lines for each gap are open circuited at their ends. The undualtor has a structure similar to the accelerator, except that the transmission lines for each gap are substantially short circuited at their ends, thus converting the electric field into magnetic field. A small amount of resistance is retained in order to generate a small electric field for replenishing the electron bunch with the energy lost as it traverses through the undulator structure.

Villa, Francesco (Alameda, CA)

1990-01-01T23:59:59.000Z

451

Study of microscopic structure of porous media - fine coal filter cakes  

SciTech Connect (OSTI)

The macroscopic properties of the porous media, e.g., permeability, capillary pressure, relative permeability, depend upon the microscopic structure of the porous medium. In the coal preparation plants, the filtration and dewatering rates of the fine coal filter cakes are important in determining the final moisture content. The microscopic structure of the porous coal filter cakes plays an important role in these operations. Moreover, the two phase flow through the porous medium can be explained in detail by considering its pore structure. Hence, the development of a technique for the micro-structural analysis of unconsolidated coal filter cakes is investigated. The technique developed is also applicable to many consolidated porous media like sandstones, rocks, etc. Optical methods were utilized to study the micro-structure of fine coal cakes. The investigation of -32 mesh Pittsburgh seam coal cakes reveals a non-uniform structure at low solid concentration of 0.33 kg coal/kg water. An increase in the solid concentration in the slurry produces a more uniform structure with an increase in the filtration and dewatering rates. It was found that coal filter cakes are incompressible over the range of 28 to 67 kPa applied vacuum. An important aspect of this work was to provide quantitative information about the presence of air bubbles in the coal filter cakes. These air bubbles are evolved from the aerated slurry and they reduce the filtration rates. A linear correlation between the particle and pore size distribution of -32 mesh Pittsburgh coal was found.

Kakwani, R.M.

1983-01-01T23:59:59.000Z

452

A Scanning Tunneling Microscope at the Milli-Kelvin, High Magnetic Field  

E-Print Network [OSTI]

preparation in ultra-high vac- uum (UHV) and spectroscopic mapping with an electronic temperature of 240 mK.3 K) directly leverage the resulting combination of ultra-low temperature and atomic resolution

Petta, Jason

453

Electronics Stewardship | Department of Energy  

Broader source: Energy.gov (indexed) [DOE]

Electronics Electronics Stewardship Electronics Stewardship Mission The team promotes sustainable management of LM's electronic equipment by integrating the relevant requirements of Executive Order (EO) 13423, Strengthening Federal Environmental, Energy, and Transportation Management, and (EO) 13514, Federal Leadership in Environmental, Energy, and Economic Performance, and DOE Order 436.1, Departmental Sustainability, with LM activities, as approved by LM. The team advocates environmentally sound electronic stewardship practices. Scope The team uses a life-cycle approach to reduce the negative environmental impacts posed by electronic equipment. Established processes evaluate beneficial acquisition, use, and disposition of electronic equipment. Key Expectations Propose electronic stewardship goals/targets.

454

Sandia National Laboratories: quantum electronics  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

electronics EFRC Scientist Weng Chow Awarded the Quantum Electronics Award On July 24, 2013, in Energy, Energy Efficiency, News, News & Events, Solid-State Lighting EFRC Sr....

455

Tim Kuneli, Electronics Maintenance Group  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Tim Kuneli, Electronics Maintenance Group Print The recent ALS power supply failure was one of the most challenging projects that Electronics Engineer Technical Superintendent Tim...

456

Circular free-electron laser  

DOE Patents [OSTI]

A high efficiency, free electron laser utilizing a circular relativistic electron beam accelerator and a circular whispering mode optical waveguide for guiding optical energy in a circular path in the circular relativistic electron beam accelerator such that the circular relativistic electron beam and the optical energy are spatially contiguous in a resonant condition for free electron laser operation. Both a betatron and synchrotron are disclosed for use in the present invention. A free electron laser wiggler is disposed around the circular relativistic electron beam accelerator for generating a periodic magnetic field to transform energy from the circular relativistic electron beam to optical energy.

Brau, Charles A. (Los Alamos, NM); Kurnit, Norman A. (Santa Fe, NM); Cooper, Richard K. (Los Alamos, NM)

1984-01-01T23:59:59.000Z

457

Electron Trapping by Molecular Vibration  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Trapping by Molecular Vibration Print In photoelectron spectroscopy experiments performed at the ALS, a group of researchers has found that electronic transitions normally...

458

Electron Trapping by Molecular Vibration  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electron Trapping by Molecular Vibration Electron Trapping by Molecular Vibration Print Wednesday, 27 April 2005 00:00 In photoelectron spectroscopy experiments performed at the...

459

Role of two-electron processes in the excitation-ionization of lithium atoms by fast ion impact  

E-Print Network [OSTI]

We study excitation and ionization in the 1.5 MeV/amu O$^{8+}$-Li collision system, which was the subject of a recent reaction-microscope-type experiment [Fischer \\textit{et al.}, Phys. Rev. Lett. \\textbf{109}, 113202 (2012)]. Starting from an independent-electron model based on determinantal wave functions and using single-electron basis generator method and continuum distorted-wave with eikonal initial-state calculations we show that pure single ionization of a lithium $K$-shell electron is too weak a process to explain the measured single differential cross section. Rather, our analysis suggests that two-electron excitation-ionization processes occur and have to be taken into account when comparing with the data. Good agreement is obtained only if we replace the independent-electron calculation by an independent-event model for one of the excitation-ionization processes and also take a shake-off process into account.

Kirchner, T; Gulyás, L

2015-01-01T23:59:59.000Z

460

An electronic radiation of blackbody: Cosmic electron background  

E-Print Network [OSTI]

The Universe owns the electronic radiation of blackbody at temperature 2.725 K, which we call the cosmic electron background. We calculate its radiation spectrum. The energy distribution of number density of electrons in the cosmic electron background becomes zero as energy goes to both zero and infinity. It has one maximum peak near the energy level of 10**(-23) J.

Jian-Miin Liu

2008-02-23T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


461

Electronic Survey Methodology Page 1 Electronic Survey Methodology  

E-Print Network [OSTI]

Electronic Survey Methodology Page 1 Electronic Survey Methodology: A Case Study in Reaching Hard, Maryland preece@umbc.edu 2002 © Andrews, Nonnecke and Preece #12;Electronic Survey Methodology Page 2 Conducting Research on the Internet: Electronic survey Design, Development and Implementation Guidelines

Nonnecke, Blair

462

Continuous-wave laser annealing of Si-rich oxide: A microscopic picture of macroscopic Si-SiO{sub 2} phase separation  

SciTech Connect (OSTI)

We report on the first observation of the macroscopic (long-range) Si-SiO{sub 2} phase separation in Si-rich oxide SiO{sub x}(x<2) obtained by continuous-wave laser annealing of free-standing SiO{sub x} films. The effect is analyzed by a unique combination of microscopic methods (Raman, transmission, photoluminescence, and infrared spectroscopy, transmission electron microscopy, electron energy loss spectroscopy, and x-ray photoelectron spectroscopy). Three regions can be distinguished on a SiO{sub x} free-standing film after 488 nm laser annealing at intensities above {approx}10{sup 4} W cm{sup -2}: central spot, ring around the central spot, and pristine film outside the irradiated area. In the pristine SiO{sub x} material, small Si nanocrystals (Si-nc) (diameters of a few nanometer) are surrounded by SiO{sub 2} with an addition of residual suboxides, the Si-nc being produced by annealing at 1100 deg. C in a furnace. The central spot of the laser-annealed area (up to {approx}30 {mu}m wide in these experiments) is practically free of Si excess and mainly consists of amorphous SiO{sub 2}. The ring around the central spot contains large spherical Si-nc (diameters up to {approx}100 nm) embedded in amorphous SiO{sub 2} without the presence of suboxides. Laser-induced temperatures in the structurally modified regions presumably exceed the Si melting temperature. The macroscopic Si-SiO{sub 2} phase separation is connected with extensive diffusion in temperature gradient leading to the Si concentration gradient. The present work demonstrates the advantages of high spatial resolution for analysis in materials research.

Khriachtchev, Leonid; Nikitin, Timur; Raesaenen, Markku; Domanskaya, Alexandra [Laboratory of Physical Chemistry, University of Helsinki, P.O. Box 55, FIN-00014 (Finland); Boninelli, Simona; Iacona, Fabio [MATIS IMM CNR, Via Santa Sofia 64, I-95123 Catania (Italy); Engdahl, Anders [MAX-lab, Lund University, P.O. Box 118, 22100 Lund (Sweden); Juhanoja, Jyrki [Top Analytica, Ruukinkatu 4, FIN-20540 Turku (Finland); Novikov, Sergei [Electron Physics Laboratory, Aalto University, P.O. Box 3000, FIN-02015 HUT (Finland)

2010-12-15T23:59:59.000Z

463

Electronic Spectroscopy & Dynamics  

SciTech Connect (OSTI)

The Gordon Research Conference (GRC) on Electronic Spectroscopy and Dynamics was held at Colby College, Waterville, NH from 07/19/2009 thru 07/24/2009. The Conference was well-attended with participants (attendees list attached). The attendees represented the spectrum of endeavor in this field coming from academia, industry, and government laboratories, both U.S. and foreign scientists, senior researchers, young investigators, and students. The GRC on Electronic Spectroscopy & Dynamics showcases some of the most recent experimental and theoretical developments in electronic spectroscopy that probes the structure and dynamics of isolated molecules, molecules embedded in clusters and condensed phases, and bulk materials. Electronic spectroscopy is an important tool in many fields of research, and this GRC brings together experts having diverse backgrounds in physics, chemistry, biophysics, and materials science, making the meeting an excellent opportunity for the interdisciplinary exchange of ideas and techniques. Topics covered in this GRC include high-resolution spectroscopy, biological molecules in the gas phase, electronic structure theory for excited states, multi-chromophore and single-molecule spectroscopies, and excited state dynamics in chemical and biological systems.

Mark Maroncelli, Nancy Ryan Gray

2010-06-08T23:59:59.000Z

464

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Acknowledgment Acknowledgment EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Becoming a User Submit a Proposal End-of-Proposal Report Acknowledgment User Training User Safety User Status Instrument Access User Committee User Meetings Data Storage Policy Visiting the EMC Instrument Calendars Info for EMC Staff SÃ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers Acknowledgment Please acknowledge your use of the EMC in your publications and presentations with the following acknowledgment statement: The electron microscopy was accomplished at the Electron Microscopy Center at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC.

465

Foil Electron Multiplier  

DOE Patents [OSTI]

An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. The foil thickness enables the incident particles to travel through the foil and continue on to an anode or to a next foil in series with the first foil. The foil, or foils, and anode are contained within a supporting structure that is attached within an evacuated enclosure. An electrical power supply is connected to the foil, or foils, and the anode to provide an electrical field gradient effective to accelerate negatively charged incident particles and the generated secondary electrons through the foil, or foils, to the anode for collection.

Funsten, Herbert O. (Los Alamos, NM); Baldonado, Juan R. (Los Alamos, NM); Dors, Eric E. (Los Alamos, NM); Harper, Ronnie W. (Los Alamos, NM); Skoug, Ruth M. (Los Alamos, NM)

2006-03-28T23:59:59.000Z

466

A microscopic model for thin lm spreading Douglas B. Abraham 1 , Rodolfo Cuerno 2 , and Esteban Moro 1  

E-Print Network [OSTI]

A microscopic model for thin #12;lm spreading Douglas B. Abraham 1 , Rodolfo Cuerno 2 , and Esteban-temporal uc- tuations of the precursor #12;lm observed in spreading experiments. Matter is transported both;lm about one molecule thick; this can be followed laterally out to an extension of the order of 10 7

Moro, Esteban

467

Microscope maps the graphene terrain A. E. Curtin, W. G. Cullen, M. S. Fuhrer, (Maryland MRSEC DMR 0520471)  

E-Print Network [OSTI]

Microscope maps the graphene terrain A. E. Curtin, W. G. Cullen, M. S. Fuhrer, (Maryland MRSEC DMR in the electrical potential on the surface of graphene on silicon carbide, shown here as different colors. KPM identifies single layer graphene (SLG), bilayer graphene (BLG), and two types of interfacial layer (IL1

Shapiro, Benjamin

468

Traffic operational characteristics at all-way-stop-controlled intersections were investigated by using AWSIM, a microscopic simulation model. The  

E-Print Network [OSTI]

by using AWSIM, a microscopic simulation model. The effects of vehicle arrival distribution and traffic- neers for the purpose of design and operational studies. Simulation models provide alternative means for transportation studies when analytical models cannot provide satisfactory solutions. Although several simulation

Tian, Zong Z.

469

ElectronicFabrication  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Fabrication Fabrication Manufacturing Technologies Electronic Fabrication provides our cus- tomers solutions for the packaging design, production acceptable prototype fabrica- tion, or deliverable production fabrication. Capabilities * Final electronic product packaging from sketches and verbal instructions * Provide CAD drawing package after project completion if no formal prints are available * Complete system development and fab- rication through concurrent engineering * Concurrent engineering in prototype and production fabrication * Integrate commercial equipment into prototype system design * Implementation and modification of commercial equipment * Packaging of prototype into finalized product assembly Resources * Customer assistance from fabrication, to testing, to complete system installation

470

ElectronicPackaging  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Packaging Packaging Manufacturing Technologies The Electronic Packaging technologies in the Thin Film, Vacuum, and Packaging Department are a resource for all aspects of microelectronic packag- ing. From design and layout to fabrication of proto- type samples, the staff offers partners the opportu- nity for concurrent engineering and development of a variety of electronic packaging concepts. This includes assistance in selecting the most appropri- ate technology for manufacturing, analysis of per- formance characteristics and development of new and unique processes. Capabilities 1. Network Fabrication * Low Temperature Co-Fired Ceramic (LTCC) * Thick Film * Thin Film 2. Packaging and Assembly * Chip Level Packaging * MEMs Packaging * Hermetic Sealing * Surface Mount Technology

471

Precision electron polarimetry  

SciTech Connect (OSTI)

A new generation of precise Parity-Violating experiments will require a sub-percent accuracy of electron beam polarimetry. Compton polarimetry can provide such accuracy at high energies, but at a few hundred MeV the small analyzing power limits the sensitivity. Mo/ller polarimetry provides a high analyzing power independent on the beam energy, but is limited by the properties of the polarized targets commonly used. Options for precision polarimetry at 300 MeV will be discussed, in particular a proposal to use ultra-cold atomic hydrogen traps to provide a 100%-polarized electron target for Mo/ller polarimetry.

Chudakov, E. [Jefferson Lab 12000 Jefferson Ave, STE 16, Newport News, VA 23606 (United States)

2013-11-07T23:59:59.000Z

472

WETTABILITY AND IMBIBITION: MICROSCOPIC DISTRIBUTION OF WETTING AND ITS CONSEQUENCES AT THE CORE AND FIELD SCALES  

SciTech Connect (OSTI)

The questions of reservoir wettability have been approached in this project from three directions. First, we have studied the properties of crude oils that contribute to wetting alteration in a reservoir. A database of more than 150 different crude oil samples has been established to facilitate examination of the relationships between crude oil chemical and physical properties and their influence on reservoir wetting. In the course of this work an improved SARA analysis technique was developed and major advances were made in understanding asphaltene stability including development of a thermodynamic Asphaltene Solubility Model (ASM) and empirical methods for predicting the onset of instability. The CO-Wet database is a resource that will be used to guide wettability research in the future. The second approach is to study crude oil/brine/rock interactions on smooth surfaces. Contact angle measurements were made under controlled conditions on mica surfaces that had been exposed to many of the oils in the CO-Wet database. With this wealth of data, statistical tests can now be used to examine the relationships between crude oil properties and the tendencies of those oils to alter wetting. Traditionally, contact angles have been used as the primary wetting assessment tool on smooth surfaces. A new technique has been developed using an atomic forces microscope that adds a new dimension to the ability to characterize oil-treated surfaces. Ultimately we aim to understand wetting in porous media, the focus of the third approach taken in this project. Using oils from the CO-Wet database, experimental advances have been made in scaling the rate of imbibition, a sensitive measure of core wetting. Application of the scaling group to mixed-wet systems has been demonstrated for a range of core conditions. Investigations of imbibition in gas/liquid systems provided the motivation for theoretical advances as well. As a result of this project we have many new tools for studying wetting at microscopic and macroscopic scales and a library of well-characterized fluids for use in studies of crude oil/brine/rock interactions.

Jill S. Buckley; Norman R. Morrow; Chris Palmer; Purnendu K. Dasgupta

2003-02-01T23:59:59.000Z

473

Diamondoid monolayers as electron emitters  

DOE Patents [OSTI]

Provided are electron emitters based upon diamondoid monolayers, preferably self-assembled higher diamondoid monolayers. High intensity electron emission has been demonstrated employing such diamondoid monolayers, particularly when the monolayers are comprised of higher diamondoids. The application of such diamondoid monolayers can alter the band structure of substrates, as well as emit monochromatic electrons, and the high intensity electron emissions can also greatly improve the efficiency of field-effect electron emitters as applied to industrial and commercial applications.

Yang, Wanli (El Cerrito, CA); Fabbri, Jason D. (San Francisco, CA); Melosh, Nicholas A. (Menlo Park, CA); Hussain, Zahid (Orinda, CA); Shen, Zhi-Xun (Stanford, CA)

2012-04-10T23:59:59.000Z

474

Energy Storage & Power Electronics 2008 Peer Review - Power Electronics  

Broader source: Energy.gov (indexed) [DOE]

& Power Electronics 2008 Peer Review - Power & Power Electronics 2008 Peer Review - Power Electronics (PE) Systems Presentations Energy Storage & Power Electronics 2008 Peer Review - Power Electronics (PE) Systems Presentations The 2008 Peer Review Meeting for the DOE Energy Storage and Power Electronics Program (ESPE) was held in Washington DC on Sept. 29-30, 2008. Current and completed program projects were presented and reviewed by a group of industry professionals. The 2008 agenda was composed of 28 projects that covered a broad range of new and ongoing, state-of-the-art, energy storage and power electronics technologies, including updates on the collaborations among DOE/ESPE, CEC in California, and NYSERDA in New York. Power Electronics (PE) Systems presentations are available below. ESPE 2008 Peer Review - High Power Density Silicon Carbide Power Electronic

475

Electron Microscopy Center  

Broader source: All U.S. Department of Energy (DOE) Office Webpages

Laboratory Laboratory Electron Microscopy Center Argonne Home > EMC > EMC Home Overview Personnel Resources Highlights Publications Visit EMC Contact Info Information for Users Instrument Calendars Info for EMC Staff SÃ…MM Facility TEAM Project Microscopy Links Argonne Facilities DOE/BES Facilities DOE/BES BES Electron Beam Microcharacterization Centers An Office of Science User Facility The Electron Microscopy Center (EMC) at Argonne National Laboratory develops and maintains unique capabilities for electron beam characterization and applies those capabilities to solve materials problems. The EMC staff carry out research with collaborators and users from Argonne, universities, and other laboratories. The expertise and facilities of the EMC additionally serve a group of national and international researchers. The EMC emphasizes three major areas: materials research, technique and instrumentation development, and operation as a national research facility. Research by EMC personnel includes microscopy based studies in high Tc superconducting materials, irradiation effects in metals and semiconductors, phase transformations, and processing related structure and chemistry of interfaces in thin films.

476

Electronic Component Obsolescence  

SciTech Connect (OSTI)

Electronic component obsolescence occurs when parts are no longer available to support the manufacture and/or repair of equipment still in service. Future instrumentation containing complex components WILL face obsolescence issues as technology advances. This paper describes hardware and software obsolescence as well as factors to consider when designing new instrumentation.

Sohns, Carl William [ORNL; Ward, Christina D [ORNL

2010-01-01T23:59:59.000Z

477

GRAPHENE: ELECTRON PROPERTIES AND  

E-Print Network [OSTI]

GRAPHENE: ELECTRON PROPERTIES AND TRANSPORT PHENOMENA Leonid Levitov MIT Lecture notes and HW and magnetoresistance Quantum Hall effect reminder The half-integer QHE in graphene Energy gaps and splitting of Landau levels QHE in p-n and p-n-p junctions Spin transport at graphene edge Fine structure constant

Gabrieli, John

478

Workshop: Teachers explore electronics  

Science Journals Connector (OSTI)

Workshop: Teachers explore electronics Conference: ASE conference hits Nottingham Teacher training: Videoconferencing discovers asteroids Lecture: Annual education talk gets interactive Award: Britton receives a New Year's honour Multimedia: Multimedia conference 2010 will be held in France Conference series: ICPE travels to Thailand in 2009 Filming: Sixth-formers take physics on location

479

Calorimeter Electronics Jim Pilcher  

E-Print Network [OSTI]

Incident particles deposit their energy in a medium Tank of liquid (water or scintillator), dense medium is produced Electronics converts this signal to digital information For signal processing to calculate produced in these air showers #12;December 11, 2008 J. Pilcher6 Photo-detectors Role is to convert optical

480

Itinerant-electron magnetism  

Science Journals Connector (OSTI)

... A conference on Itinerant-Electron Magnetism was held in Oxford on September 13?15, 1976. It was sponsored by the ... was held in Oxford on September 13?15, 1976. It was sponsored by the Magnetism Section of the European Physical Society and the Institute of Physics. The Proceedings will ...

E. P. Wohlfarth

1976-11-18T23:59:59.000Z

Note: This page contains sample records for the topic "aberration-corrected electron microscope" from the National Library of EnergyBeta (NLEBeta).
While these samples are representative of the content of NLEBeta,
they are not comprehensive nor are they the most current set.
We encourage you to perform a real-time search of NLEBeta
to obtain the most current and comprehensive results.


481

Electron beam cutting  

DOE Patents [OSTI]

A method for the cutting of holes 20 Angstroms in diameter, or lines 20 Angstroms wide in a material having positive ionic conduction by the use of a focused electron probe is described. The holes and lines are stable under ambient conditions.

Mochel, Margaret E. (Champaign, IL); Humphreys, Colin J. (Abingdon, GB2)

1985-04-02T23:59:59.000Z

482

TRANSFORM a electronics  

E-Print Network [OSTI]

THE DISCRETE FRACTIONAL FOURIER TRANSFORM a thesis submitted to the department of electrical TRANSFORM C ¸a~ gatay Candan M.S. in Electrical and Electronics Engineering Supervisor: Haldun M. ¨ Ozakta Transform (FrFT) is proposed, discussed and consolidated. The discrete trans­ form generalizes the Discrete

Candan, Cagatay

483

Argonne CNM: Electronic & Magnetic Materials & Devices Capabilities  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

Electronic & Magnetic Materials & Devices Capabilities Synthesis Colloidal chemistry and self-assembly techniques Complex oxide film synthesis via molecular beam epitaxy (DCA R450 Custom) Physical vapor deposition (Lesker CMS 18 and PVD 250) Spin coating (Laurell WS-400) Characterization Variable-temperature (VT) scanning tunneling microscope with atomic force microscopy capabilities (Omicron VT-AFM/STM), operates in an ultrahigh vacuum (UHV) environment with a base pressure of < 1E-10 mbar and 55-400 K. Atomic resolution is routinely obtained at room temperature and below. The AFM capabilities support a range of scanning modes. The analysis chamber also houses a LEED/Auger with an attached preparation chamber for sample cleaning and deposition (sputter cleaning, direct current heating, e-beam heating stage, metal deposition, etc.)

484

Contacting nanowires and nanotubes with atomic precision for electronic transport  

SciTech Connect (OSTI)

Making contacts to nanostructures with atomic precision is an important process in the bottom-up fabrication and characterization of electronic nanodevices. Existing contacting techniques use top-down lithography and chemical etching, but lack atomic precision and introduce the possibility of contamination. Here, we report that a field-induced emission process can be used to make local contacts onto individual nanowires and nanotubes with atomic spatial precision. The gold nano-islands are deposited onto nanostructures precisely by using a scanning tunneling microscope tip, which provides a clean and controllable method to ensure both electrically conductive and mechanically reliable contacts. To demonstrate the wide applicability of the technique, nano-contacts are fabricated on silicide atomic wires, carbon nanotubes, and copper nanowires. The electrical transport measurements are performed in situ by utilizing the nanocontacts to bridge the nanostructures to the transport probes.

Qin, Shengyong [ORNL; Hellstrom, Sondra L [ORNL; Bao, Zhenan [ORNL; Boyanov, Boyan [Intel Corporation; Li, An-Ping [ORNL

2012-01-01T23:59:59.000Z

485

Scientists combine X-rays and microscopes for precise experiments | Argonne  

Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. This insulator-coated "smart tip" for synchrotron X-ray scanning tunneling microscopy confines the signal detection to a tiny region of a sample. The nanofabricated tips have been developed by an Argonne team led by Argonne nanoscientist Volker Rose to improve the sensitivity of the SXSTM technique. To view a larger version of the image, click on it. Scientists combine X-rays and microscopes for precise experiments

486

Microscopic Description of Entanglements in Polyethylene Networks and Melts: Strong, Weak, Pairwise, and Collective Attributes  

E-Print Network [OSTI]

We present atomistic molecular dynamics simulations of two Polyethylene systems where all entanglements are trapped: a perfect network, and a melt with grafted chain ends. We examine microscopically at what level topological constraints can be considered as a collective entanglement effect, as in tube model theories, or as certain pairwise uncrossability interactions, as in slip-link models. A pairwise parameter, which varies between these limiting cases, shows that, for the systems studied, the character of the entanglement environment is more pairwise than collective. We employ a novel methodology, which analyzes entanglement constraints into a complete set of pairwise interactions, similar to slip links. Entanglement confinement is assembled by a plethora of links, with a spectrum of confinement strengths, from strong to weak. The strength of interactions is quantified through a link `persistence', which is the fraction of time for which the links are active. By weighting links according to their strength, we show that confinement is imposed mainly by the strong ones, and that the weak, trapped, uncrossability interactions cannot contribute to the low frequency modulus of an elastomer, or the plateau modulus of a melt. A self-consistent scheme for mapping topological constraints to specific, strong binary links, according to a given entanglement density, is proposed and validated. Our results demonstrate that slip links can be viewed as the strongest pairwise interactions of a collective entanglement environment. The methodology developed provides a basis for bridging the gap between atomistic simulations and mesoscopic slip link models.

Stefanos D. Anogiannakis; Christos Tzoumanekas; Doros N. Theodorou

2013-01-30T23:59:59.000Z

487

Microscopic mechanisms of metastable phase formation during ball milling of intermetallic TiAl phases  

SciTech Connect (OSTI)

Powders of the intermetallic equilibrium phases {alpha}{sub 2}-Ti{sub 3}Al, {gamma}-TiAl and TiAl{sub 3} were ball milled in order to investigate the microscopic origins of the energetic destabilization and the transformation into metastable phases during the milling process. It was found that the intermetallic phases were chemically partially disordered on milling followed by the transformation into solid solution phases after long milling. In detail, for the {gamma} phase, the formation of numerous deformation twins, thin h.c.p. lamellae and lamellae of the 9R phase formed by an antitwin operation was observed by TEM. The disordering of the D0{sub 22}-TiAl{sub 3} phase occurred inhomogeneously in the material via the formation of antiphase boundaries on (001) planes, resulting in a f.c.c. solid solution in the final state. In summary, it can be concluded that the formation of the observed metastable phases results from chemical disordering, whereas the excess enthalpy of grain boundaries plays only a minor role for the energetical destabilization of the intermetallic compounds during milling in this case.

Klassen, T.; Oehring, M.; Bormann, R. [GKSS Research Centre, Geesthacht (Germany)] [GKSS Research Centre, Geesthacht (Germany)

1997-09-01T23:59:59.000Z

488

Microscopic self-energy calculations and dispersive optical-model potentials  

E-Print Network [OSTI]

Nucleon self-energies for 40Ca, 48Ca, 60Ca isotopes are generated with the microscopic Faddeev-random-phase approximation (FRPA). These self-energies are compared with potentials from the dispersive optical model (DOM) that were obtained from fitting elastic-scattering and bound-state data for 40Ca and 48Ca. The \\textit{ab initio} FRPA is capable of explaining many features of the empirical DOM potentials including their nucleon asymmetry dependence. The comparison furthermore provides several suggestions to improve the functional form of the DOM potentials, including among others the exploration of parity and angular momentum dependence. The non-locality of the FRPA imaginary self-energy, illustrated by a substantial orbital angular momentum dependence, suggests that future DOM fits should consider this feature explicitly. The roles of the nucleon-nucleon tensor force and charge-exchange component in generating the asymmetry dependence of the FPRA self-energies are explored. The global features of the FRPA self-energies are not strongly dependent on the choice of realistic nucleon-nucleon interaction.

S. J. Waldecker; C. Barbieri; W. H. Dickhoff

2011-05-21T23:59:59.000Z

489

Microscopic Theory of Protein Folding Rates.II: Local Reaction Coordinates and Chain Dynamics  

E-Print Network [OSTI]

The motion involved in barrier crossing for protein folding are investigated in terms of the chain dynamics of the polymer backbone, completing the microscopic description of protein folding presented in the previous paper. Local reaction coordinates are identified as collective growth modes of the unstable fluctuations about the saddle-points in the free energy surface. The description of the chain dynamics incorporates internal friction (independent of the solvent viscosity) arising from the elementary isomerizations of the backbone dihedral angles. We find that the folding rate depends linearly on the solvent friction for high viscosity, but saturates at low viscosity because of internal friction. For $\\lambda$-repressor, the calculated folding rate prefactor, along with the free energy barrier from the variational theory, gives a folding rate that agrees well with the experimentally determined rate under highly stabilizing conditions, but the theory predicts too large a folding rate at the transition midpoint. This discrepancy obtained using a fairly complete quantitative theory inspires a new set of questions about chain dynamics, specifically detailed motions in individual contact formation.

John J. Portman; Shoji Takada; Peter G. Wolynes

2000-08-30T23:59:59.000Z

490

Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: A kinetostatic method  

SciTech Connect (OSTI)

Our previous study of the particle mass sensor has shown a large ratio (up to thousands) between the spring constants of a rectangular cantilever in higher mode vibration and at the static bending or natural mode vibration. This has been proven by us through the derived nodal point position equation. That solution is good for a cantilever with the free end in noncontact regime and the probe shifted from the end to an effective section and contacting a soft object. Our further research shows that the same nodal position equation with the proper frequency equations may be used for the same spring constant ratio estimation if the vibrating at higher mode cantilever's free end has a significant additional mass clamped to it or that end is in permanent contact with an elastic or hard measurand object (reference cantilever). However, in the latter case, the spring constant ratio is much smaller (in tens) than in other mentioned cases at equal higher (up to fourth) vibration modes. We also present the spring constant ratio for a vibrating at higher eigenmode V-shaped cantilever, which is now in wide use for atomic force microscopy. The received results on the spring constant ratio are in good (within a few percent) agreement with the theoretical and experimental data published by other researchers. The knowledge of a possible spring constant transformation is important for the proper calibration and use of an atomic force microscope with vibrating cantilever in the higher eigenmodes for measurement and imaging with enlarged resolution.

Tseytlin, Yakov M. [Instrument Society of America, 20 Randall Street, Apt. 5G, Providence, Rhode Island 02904 (United States)

2008-02-15T23:59:59.000Z

491

A New Scanning Tunneling Microscope Reactor Used for High Pressure and High Temperature Catalysis Studies  

SciTech Connect (OSTI)

We present the design and performance of a home-built high-pressure and high-temperature reactor equipped with a high-resolution scanning tunneling microscope (STM) for catalytic studies. In this design, the STM body, sample, and tip are placed in a small high pressure reactor ({approx}19 cm{sup 3}) located within an ultrahigh vacuum (UHV) chamber. A sealable port on the wall of the reactor separates the high pressure environment in the reactor from the vacuum environment of the STM chamber and permits sample transfer and tip change in UHV. A combination of a sample transfer arm, wobble stick, and sample load-lock system allows fast transfer of samples and tips between the preparation chamber, high pressure reactor, and ambient environment. This STM reactor can work as a batch or flowing reactor at a pressure range of 10{sup -13} to several bars and a temperature range of 300-700 K. Experiments performed on two samples both in vacuum and in high pressure conditions demonstrate the capability of in situ investigations of heterogeneous catalysis and surface chemistry at atomic resolution at a wide pressure range from UHV to a pressure higher than 1 atm.

Tao, Feng; Tang, David C.; Salmeron, Miquel; Somorjai, Gabor A.

2008-05-12T23:59:59.000Z

492

A high-pressure atomic force microscope for imaging in supercritical carbon dioxide  

SciTech Connect (OSTI)

A high-pressure atomic force microscope (AFM) that enables in situ, atomic scale measurements of topography of solid surfaces in contact with supercritical CO{sub 2} (scCO{sub 2}) fluids has been developed. This apparatus overcomes the pressure limitations of the hydrothermal AFM and is designed to handle pressures up to 100 atm at temperatures up to ?350 K. A standard optically-based cantilever deflection detection system was chosen. When imaging in compressible supercritical fluids such as scCO{sub 2} , precise control of pressure and temperature in the fluid cell is the primary technical challenge. Noise levels and imaging resolution depend on minimization of fluid density fluctuations that change the fluid refractive index and hence the laser path. We demonstrate with our apparatus in situ atomic scale imaging of a calcite (CaCO{sub 3}) mineral surface in scCO{sub 2}; both single, monatomic steps and dynamic processes occurring on the (10{overbar 1}4) surface are presented. This new AFM provides unprecedented in situ access to interfacial phenomena at solid–fluid interfaces under pressure.

Lea, A.S.; Higgins, S.R.; Knauss, K.G.; Rosso, K.M.

2011-01-15T23:59:59.000Z

493

Microscopic determinants of the weak-form efficiency of an artificial order-driven stock market  

E-Print Network [OSTI]

Stock markets are efficient in the weak form in the sense that no significant autocorrelations can be identified in the returns. However, the microscopic mechanisms are unclear. We aim at understanding the impacts of order flows on the weak-form efficiency through computational experiments based on an empirical order-driven model. Three possible determinants embedded in the model are investigated, including the tail heaviness of relative prices of the placed orders characterized by the tail index $\\alpha_x$, the degree of long memory in relative prices quantified by its Hurst index $H_x$, and the strength of long memory in order direction depicted by $H_x$. It is found that the degree of autocorrelations in returns (quantified by its Hurst index $H_r$) is negatively correlated with $\\alpha_x$ and $H_x$ and positively correlated with $H_s$. In addition, the values of $\\alpha_x$ and $H_x$ have negligible impacts on $H_r$, whereas $H_s$ exhibits a dominating impact on $H_r$. Our results suggest that stock market...