National Library of Energy BETA

Sample records for aberration-corrected electron microscope

  1. Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution

    SciTech Connect (OSTI)

    Akashi, Tetsuya; Takahashi, Yoshio; Tanigaki, Toshiaki Shimakura, Tomokazu; Kawasaki, Takeshi; Furutsu, Tadao; Shinada, Hiroyuki; Osakabe, Nobuyuki; Mller, Heiko; Haider, Maximilian; Tonomura, Akira

    2015-02-16

    Atomic-resolution electromagnetic field observation is critical to the development of advanced materials and to the unveiling of their fundamental physics. For this purpose, a spherical-aberration corrected 1.2-MV cold field-emission transmission electron microscope has been developed. The microscope has the following superior properties: stabilized accelerating voltage, minimized electrical and mechanical fluctuation, and coherent electron emission. These properties have enabled to obtain 43-pm information transfer. On the bases of these performances, a 43-pm resolution has been obtained by correcting lens aberrations up to the third order. Observations of GaN [411] thin crystal showed a projected atomic locations with a separation of 44?pm.

  2. In situ observation on hydrogenation of Mg-Ni films using environmental transmission electron microscope with aberration correction

    SciTech Connect (OSTI)

    Matsuda, Junko; Yoshida, Kenta; Sasaki, Yukichi; Uchiyama, Naoki; Akiba, Etsuo

    2014-08-25

    In situ transmission electron microscopy (TEM) was performed to observe the hydrogenation of Mg-Ni films in a hydrogen atmosphere of 80100?Pa. An aberration-corrected environmental TEM with a differential pumping system allows us to reveal the Angstrom-scale structure of the films in the initial stage of hydrogenation: first, nucleation and growth of Mg{sub 2}NiH{sub 4} crystals with a lattice spacing of 0.22?nm in an Mg-rich amorphous matrix of the film occurs within 20 s after the start of the high-resolution observation, then crystallization of MgH{sub 2} with a smaller spacing of 0.15?nm happens after approximately 1?min. Our in situ TEM method is also applicable to the analysis of other hydrogen-related materials.

  3. In-situ Study of Dynamic Phenomena at Metal Nanosolder Interfaces Using Aberration Corrected Scanning Transmission Electron Microcopy.

    SciTech Connect (OSTI)

    Lu, Ping

    2014-10-01

    Controlling metallic nanoparticle (NP) interactions plays a vital role in the development of new joining techniques (nanosolder) that bond at lower processing temperatures but remain viable at higher temperatures. The pr imary objective of this project is t o develop a fundamental understanding of the actual reaction processes, associated atomic mechanisms, and the resulting microstructure that occur during thermally - driven bond formation concerning metal - metal nano - scale (<50nm) interfaces. In this LDRD pr oject, we have studied metallic NPs interaction at the elevated temperatures by combining in - situ transmission electron microscopy (TEM ) using an aberration - corrected scanning transmission electron microscope (AC - STEM) and atomic - scale modeling such as m olecular dynamic (MD) simulations. Various metallic NPs such as Ag, Cu and Au are synthesized by chemical routines. Numerous in - situ e xperiments were carried out with focus of the research on study of Ag - Cu system. For the first time, using in - situ STEM he ating experiments , we directly observed t he formation of a 3 - dimensional (3 - D) epitaxial Cu - Ag core - shell nanoparticle during the thermal interaction of Cu and Ag NPs at elevated temperatures (150 - 300 o C). The reaction takes place at temperatures as low as 150 o C and was only observed when care was taken to circumvent the effects of electron beam irradiation during STEM imaging. Atomic - scale modeling verified that the Cu - Ag core - shell structure is energetically favored, and indicated that this phenomenon is a nano - scale effect related to the large surface - to - volume ratio of the NPs. The observation potentially can be used for developing new nanosolder technology that uses Ag shell as the %22glue%22 that stic ks the particles of Cu together. The LDRD has led to several journal publications and numerous conference presentations, and a TA. In addition, we have developed new TEM characterization techniques and phase

  4. Device and method for creating Gaussian aberration-corrected electron beams

    DOE Patents [OSTI]

    McMorran, Benjamin; Linck, Martin

    2016-01-19

    Electron beam phase gratings have phase profiles that produce a diffracted beam having a Gaussian or other selected intensity profile. Phase profiles can also be selected to correct or compensate electron lens aberrations. Typically, a low diffraction order produces a suitable phase profile, and other orders are discarded.

  5. Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging

    SciTech Connect (OSTI)

    Schulz, T.; Remmele, T.; Korytov, M.; Markurt, T.; Albrecht, M.; Duff, A.; Lymperakis, L.; Neugebauer, J.; Chèze, C.

    2014-01-21

    Based on the evaluation of lattice parameter maps in aberration corrected high resolution transmission electron microscopy images, we propose a simple method that allows quantifying the composition and disorder of a semiconductor alloy at the unit cell scale with high accuracy. This is realized by considering, next to the out-of-plane, also the in-plane lattice parameter component allowing to separate the chemical composition from the strain field. Considering only the out-of-plane lattice parameter component not only yields large deviations from the true local alloy content but also carries the risk of identifying false ordering phenomena like formations of chains or platelets. Our method is demonstrated on image simulations of relaxed supercells, as well as on experimental images of an In{sub 0.20}Ga{sub 0.80}N quantum well. Principally, our approach is applicable to all epitaxially strained compounds in the form of quantum wells, free standing islands, quantum dots, or wires.

  6. Evaluation of stacking faults and associated partial dislocations in AlSb/GaAs (001) interface by aberration-corrected high-resolution transmission electron microscopy

    SciTech Connect (OSTI)

    Wen, C.; Ge, B. H.; Cui, Y. X.; Li, F. H.; Zhu, J.; Yu, R.; Cheng, Z. Y.

    2014-11-15

    The stacking faults (SFs) in an AlSb/GaAs (001) interface were investigated using a 300 kV spherical aberration-corrected high-resolution transmission electron microscope (HRTEM). The structure and strain distribution of the single and intersecting (V-shaped) SFs associated with partial dislocations (PDs) were characterized by the [110] HRTEM images and geometric phase analysis, respectively. In the biaxial strain maps ?{sub xx} and ?{sub yy}, a SF can be divided into several sections under different strain states (positive or negative strain values). Furthermore, the strain state for the same section of a SF is in contrast to each other in ?{sub xx} and ?{sub yy} strain maps. The modification in the strain states was attributed to the variation in the local atomic displacements for the SF in the AlSb film on the GaAs substrate recorded in the lattice image. Finally, the single SF was found to be bounded by two 30 PDs. A pair of 30 PDs near the heteroepitaxial interface reacted to form a Lomer-Cottrell sessile dislocation located at the vertices of V-shaped SFs with opposite screw components. The roles of misfit dislocations, such as the PDs, in strain relaxation were also discussed.

  7. Direct imaging of crystal structure and defects in metastable Ge{sub 2}Sb{sub 2}Te{sub 5} by quantitative aberration-corrected scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Ross, Ulrich; Lotnyk, Andriy Thelander, Erik; Rauschenbach, Bernd

    2014-03-24

    Knowledge about the atomic structure and vacancy distribution in phase change materials is of foremost importance in order to understand the underlying mechanism of fast reversible phase transformation. In this Letter, by combining state-of-the-art aberration-corrected scanning transmission electron microscopy with image simulations, we are able to map the local atomic structure and composition of a textured metastable Ge{sub 2}Sb{sub 2}Te{sub 5} thin film deposited by pulsed laser deposition with excellent spatial resolution. The atomic-resolution scanning transmission electron microscopy investigations display the heterogeneous defect structure of the Ge{sub 2}Sb{sub 2}Te{sub 5} phase. The obtained results are discussed. Highly oriented Ge{sub 2}Sb{sub 2}Te{sub 5} thin films appear to be a promising approach for further atomic-resolution investigations of the phase change behavior of this material class.

  8. Electron Microscope Facility

    ScienceCinema (OSTI)

    None

    2010-01-08

    Brookhaven Lab is home to one of only a few Scanning Transmision Electron Microscope (STEM) machines in the world and one of the few that can image single heavy atoms.

  9. Observation of Materials Processes in Liquids in the Electron Microscope

    SciTech Connect (OSTI)

    Wang, Chong M.; Liao, Honggang; Ross, Frances M.

    2015-01-01

    Materials synthesis and the functioning of devices often indispensably involve liquid media. But direct visualization of dynamic process in liquids, especially with high spatial and temporal resolution, has been challenging. For solid materials, advances in aberration corrected electron microscopy have made observation of atomic level features a routine practice. Here we discuss the extent to which one can take advantage of the resolution of modern electron microscopes to image phenomenon occuring in liquids. We will describe the fundamentals of two different experimental approaches, closed and open liquid cells. We will illustrate the capabilities of each approach by considering processes in batteries and nucleation and growth of nanoparticles from solution. We conclude that liquid cell electron microscopy appears to be duly fulfilling its role for in situ studies of nanoscale processes in liquids, revealing physical and chemical processes otherwise difficult to observe.

  10. Electron microscope phase enhancement

    DOE Patents [OSTI]

    Jin, Jian; Glaeser, Robert M.

    2010-06-15

    A microfabricated electron phase shift element is used for modifying the phase characteristics of an electron beam passing though its center aperture, while not affecting the more divergent portion of an incident beam to selectively provide a ninety-degree phase shift to the unscattered beam in the back focal plan of the objective lens, in order to realize Zernike-type, in-focus phase contrast in an electron microscope. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells. Preliminary experimental images demonstrate that these devices do apply a ninety degree phase shift as expected. Electrostatic calculations have been used to determine that fringing fields in the region of the scattered electron beams will cause a negligible phase shift as long as the ratio of electrode length to the transverse feature-size aperture is about 5:1. Calculations are underway to determine the feasibility of aspect smaller aspect ratios of about 3:1 and about 2:1.

  11. Transmission electron microscope CCD camera

    DOE Patents [OSTI]

    Downing, Kenneth H.

    1999-01-01

    In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.

  12. Nanomaterials Analysis using a Scanning Electron Microscope ...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Nanomaterials Analysis using a Scanning Electron Microscope Technology available for licensing: Steradian X-ray detection system increases the detection capability of SEMs during...

  13. Ponderomotive phase plate for transmission electron microscopes...

    Office of Scientific and Technical Information (OSTI)

    A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high ...

  14. Aberration-corrected Czerny-Turner imaging spectrometer with a wide spectral region

    SciTech Connect (OSTI)

    Xue Qingsheng; Wang Shurong; Lu Fengqin

    2009-01-01

    A modified asymmetrical Czerny-Turner arrangement with a fixed plane grating is proposed to correct aberrations over a wide spectral region by analysis of the dependence of aberration correction for different wavelengths. The principle and method of aberration correction are described in detail. We compare the performance of this modified Czerny-Turner arrangement with that of the existing Czerny-Turner arrangement by using a practical Czerny-Turner imaging spectrometer example.

  15. Ponderomotive phase plate for transmission electron microscopes

    DOE Patents [OSTI]

    Reed, Bryan W. (Livermore, CA)

    2012-07-10

    A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.

  16. Electron Microscopy > Analytical Resources > Research > The Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Materials Center at Cornell Analytical Resources In This Section Differential Electrochemical Mass Spectroscopy (DEMS) Electron Microscopy X-Ray Diffraction Electron Microscopy Aberration-Corrected Electron Microscope Facility Electron microscopy provides atomic-resolution images of the structure, composition and bonding of our fuel cells and their components. Three-dimensional images of catalyst particles and their support materials are constructed using electron tomography - a similar

  17. Simultaneous specimen and stage cleaning device for analytical electron microscope

    DOE Patents [OSTI]

    Zaluzec, Nestor J.

    1996-01-01

    An improved method and apparatus are provided for cleaning both a specimen stage, a specimen and an interior of an analytical electron microscope (AEM). The apparatus for cleaning a specimen stage and specimen comprising a plasma chamber for containing a gas plasma and an air lock coupled to the plasma chamber for permitting passage of the specimen stage and specimen into the plasma chamber and maintaining an airtight chamber. The specimen stage and specimen are subjected to a reactive plasma gas that is either DC or RF excited. The apparatus can be mounted on the analytical electron microscope (AEM) for cleaning the interior of the microscope.

  18. Influence of mechanical noise inside a scanning electron microscope

    SciTech Connect (OSTI)

    Gaudenzi de Faria, Marcelo; Haddab, Yassine Le Gorrec, Yann; Lutz, Philippe

    2015-04-15

    The scanning electron microscope is becoming a popular tool to perform tasks that require positioning, manipulation, characterization, and assembly of micro-components. However, some of these applications require a higher level of performance with respect to dynamics and precision of positioning. One limiting factor is the presence of unidentified noises and disturbances. This work aims to study the influence of mechanical disturbances generated by the environment and by the microscope, identifying how these can affect elements in the vacuum chamber. To achieve this objective, a dedicated setup, including a high-resolution vibrometer, was built inside the microscope. This work led to the identification and quantification of main disturbances and noise sources acting on a scanning electron microscope. Furthermore, the effects of external acoustic excitations were analysed. Potential applications of these results include noise compensation and real-time control for high accuracy tasks.

  19. Chromatic-aberration-corrected diffractive lenses for ultra-broadband focusing

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Wang, Peng; Mohammad, Nabil; Menon, Rajesh

    2016-02-12

    We exploit the inherent dispersion in diffractive optics to demonstrate planar chromatic-aberration-corrected lenses. Specifically, we designed, fabricated and characterized cylindrical diffractive lenses that efficiently focus the entire visible band (450 nm to 700 nm) onto a single line. These devices are essentially pixelated, multi-level microstructures. Experiments confirm an average optical efficiency of 25% for a three-wavelength apochromatic lens whose chromatic focus shift is only 1.3 μm and 25 μm in the lateral and axial directions, respectively. Super-achromatic performance over the continuous visible band is also demonstrated with averaged lateral and axial focus shifts of only 1.65 μm and 73.6 μm,more » respectively. These lenses are easy to fabricate using single-step grayscale lithography and can be inexpensively replicated. Furthermore, these devices are thin (<3 μm), error tolerant, has low aspect ratio (<1:1) and offer polarization-insensitive focusing, all significant advantages compared to alternatives that rely on metasurfaces. Lastly, our design methodology offers high design flexibility in numerical aperture and focal length, and is readily extended to 2D.« less

  20. Measurement of Semiconductor Surface Potential using the Scanning Electron Microscope

    SciTech Connect (OSTI)

    Heath, J. T.; Jiang, C. S.; Al-Jassim, M. M.

    2012-02-15

    We calibrate the secondary electron signal from a standard scanning electron microscope to voltage, yielding an image of the surface or near-surface potential. Data on both atomically abrupt heterojunction GaInP/GaAs and diffused homojunction Si solar cell devices clearly show the expected variation in potential with position and applied bias, giving depletion widths and locating metallurgical junctions to an accuracy better than 10 nm. In some images, distortion near the p-n junction is observed, seemingly consistent with the effects of lateral electric fields (patch fields). Reducing the tube bias removes this distortion. This approach results in rapid and straightforward collection of near-surface potential data using a standard scanning electron microscope.

  1. Concurrent in situ ion irradiation transmission electron microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Hattar, K.; Bufford, D. C.; Buller, D. L.

    2014-08-29

    An in situ ion irradiation transmission electron microscope has been developed and is operational at Sandia National Laboratories. This facility permits high spatial resolution, real time observation of electron transparent samples under ion irradiation, implantation, mechanical loading, corrosive environments, and combinations thereof. This includes the simultaneous implantation of low-energy gas ions (0.8–30 keV) during high-energy heavy ion irradiation (0.8–48 MeV). In addition, initial results in polycrystalline gold foils are provided to demonstrate the range of capabilities.

  2. Circular dichroism in the electron microscope: Progress and applications (invited)

    SciTech Connect (OSTI)

    Schattschneider, P.; Loeffler, S.; Ennen, I.; Stoeger-Pollach, M.; Verbeeck, J.

    2010-05-15

    According to theory, x-ray magnetic circular dichroism in a synchrotron is equivalent to energy loss magnetic chiral dichroism (EMCD) in a transmission electron microscope (TEM). After a synopsis of the development of EMCD, the theoretical background is reviewed and recent results are presented, focusing on the study of magnetic nanoparticles for ferrofluids and Heusler alloys for spintronic devices. Simulated maps of the dichroic strength as a function of atom position in the crystal allow evaluating the influence of specimen thickness and sample tilt on the experimental EMCD signal. Finally, the possibility of direct observation of chiral electronic transitions with atomic resolution in a TEM is discussed.

  3. Photocathode Optimization for a Dynamic Transmission Electron Microscope: Final Report

    SciTech Connect (OSTI)

    Ellis, P; Flom, Z; Heinselman, K; Nguyen, T; Tung, S; Haskell, R; Reed, B W; LaGrange, T

    2011-08-04

    The Dynamic Transmission Electron Microscope (DTEM) team at Harvey Mudd College has been sponsored by LLNL to design and build a test setup for optimizing the performance of the DTEM's electron source. Unlike a traditional TEM, the DTEM achieves much faster exposure times by using photoemission from a photocathode to produce electrons for imaging. The DTEM team's work is motivated by the need to improve the coherence and current density of the electron cloud produced by the electron gun in order to increase the image resolution and contrast achievable by DTEM. The photoemission test setup is nearly complete and the team will soon complete baseline tests of electron gun performance. The photoemission laser and high voltage power supply have been repaired; the optics path for relaying the laser to the photocathode has been finalized, assembled, and aligned; the internal setup of the vacuum chamber has been finalized and mostly implemented; and system control, synchronization, and data acquisition has been implemented in LabVIEW. Immediate future work includes determining a consistent alignment procedure to place the laser waist on the photocathode, and taking baseline performance measurements of the tantalum photocathode. Future research will examine the performance of the electron gun as a function of the photoemission laser profile, the photocathode material, and the geometry and voltages of the accelerating and focusing components in the electron gun. This report presents the team's progress and outlines the work that remains.

  4. Miniature self-contained vacuum compatible electronic imaging microscope

    DOE Patents [OSTI]

    Naulleau, Patrick P.; Batson, Phillip J.; Denham, Paul E.; Jones, Michael S.

    2001-01-01

    A vacuum compatible CCD-based microscopic camera with an integrated illuminator. The camera can provide video or still feed from the microscope contained within a vacuum chamber. Activation of an optional integral illuminator can provide light to illuminate the microscope subject. The microscope camera comprises a housing with a objective port, modified objective, beam-splitter, CCD camera, and LED illuminator.

  5. Migration of Single Iridium Atoms and Tri-iridium Clusters on MgO Surfaces. Aberration-Corrected STEM Imaging and ab-initio Calculations

    SciTech Connect (OSTI)

    Han, Chang W.; Iddir, Hakim; Uzun, Alper; Curtiss, Larry A.; Browning, Nigel D.; Gates, Bruce C.; Ortalan, Volkan

    2015-11-06

    To address the challenge of fast, direct atomic-scale visualization of the diffusion of atoms and clusters on surfaces, we used aberration-corrected scanning transmission electron microscopy (STEM) with high scan speeds (as little as ~0.1 s per frame) to visualize the diffusion of (1) a heavy atom (Ir) on the surface of a support consisting of light atoms, MgO(100), and (2) an Ir3 cluster on MgO(110). Sequential Z-contrast images elucidate the diffusion mechanisms, including the hopping of Ir1 and the rotational migration of Ir3 as two Ir atoms remain anchored to the surface. Density functional theory (DFT) calculations provided estimates of the diffusion energy barriers and binding energies of the iridium species to the surfaces. The results show how the combination of fast-scan STEM and DFT calculations allow real-time visualization and fundamental understanding of surface diffusion phenomena pertaining to supported catalysts and other materials.

  6. Aberration-corrected X-ray spectrum imaging and Fresnel contrast to differentiate nanoclusters and cavities in helium-irradiated alloy 14YWT

    SciTech Connect (OSTI)

    Miller, Michael K; Parish, Chad M

    2014-01-01

    Helium accumulation negatively impacts structural materials used in neutron-irradiated environments, such as fission and fusion reactors. Next-generation fission and fusion reactors will require structural materials, such as steels, resistant to large neutron doses yet see service temperatures in the range most affected by helium embrittlement. Previous work has indicated the difficulty of experimentally differentiating nanometer-sized helium bubbles from the Ti-Y-O rich nanoclustsers (NCs) in radiation-tolerant nanostructured ferritic alloys (NFAs). Because the NCs are expected to sequester helium away from grain boundaries and reduce embrittlement, experimental methods to study simultaneously the NC and bubble populations are needed. In this study, aberration-corrected scanning transmission electron microscopy (STEM) results combining high-collection-efficiency X-ray spectrum images (SIs), multivariate statistical analysis (MVSA), and Fresnel-contrast bright-field STEM imaging have been used for such a purpose. Results indicate that Fresnel-contrast imaging, with careful attention to TEM-STEM reciprocity, differentiates bubbles from NCs, and MVSA of X-ray SIs unambiguously identifies NCs. Therefore, combined Fresnel-contrast STEM and X-ray SI is an effective STEM-based method to characterize helium-bearing NFAs.

  7. Transmission electron microscope sample holder with optical features

    DOE Patents [OSTI]

    Milas, Mirko; Zhu, Yimei; Rameau, Jonathan David

    2012-03-27

    A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.

  8. A novel low energy electron microscope for DNA sequencing and surface analysis

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Mankos, M.; Shadman, K.; Persson, H. H. J.; N’Diaye, A. T.; Schmid, A. K.; Davis, R. W.

    2014-01-31

    Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) is a novel technique that is directed towards imaging nanostructures and surfaces with sub-nanometer resolution. The technique combines a monochromator, a mirror aberration corrector, an energy filter, and dual beam illumination in a single instrument. The monochromator reduces the energy spread of the illuminating electron beam, which significantly improves spectroscopic and spatial resolution. Simulation results predict that the novel aberration corrector design will eliminate the second rank chromatic and third and fifth order spherical aberrations, thereby improving the resolution into the sub-nanometer regime at landing energies as low as one hundred electron-Volts.more » The energy filter produces a beam that can extract detailed information about the chemical composition and local electronic states of non-periodic objects such as nanoparticles, interfaces, defects, and macromolecules. The dual flood illumination eliminates charging effects that are generated when a conventional LEEM is used to image insulating specimens. A potential application for MAD-LEEM is in DNA sequencing, which requires high resolution to distinguish the individual bases and high speed to reduce the cost. The MAD-LEEM approach images the DNA with low electron impact energies, which provides nucleobase contrast mechanisms without organometallic labels. Furthermore, the micron-size field of view when combined with imaging on the fly provides long read lengths, thereby reducing the demand on assembling the sequence. Finally, experimental results from bulk specimens with immobilized single-base oligonucleotides demonstrate that base specific contrast is available with reflected, photo-emitted, and Auger electrons. Image contrast simulations of model rectangular features mimicking the individual nucleotides in a DNA strand have been developed to translate measurements of contrast on bulk DNA to the

  9. Electron Microscopy Center Capabilities | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Capabilities ACAT: Argonne Chromatic Aberration-corrected TEM This FEI Titan 80-300 ST has a CEOS Cc/Cs corrector on the imaging side of the column to correct both spherical and chromatic aberrations. The Cc/Cs corrector also provides greatly-improved resolution and signal for energy filtered imaging and EELS. FEI Tecnai F20ST TEM/STEM This premier analytical transmission electron microscope (AEM) has specialized accessories including an energy-dispersive x-ray

  10. High Cycle Fatigue in the Transmission Electron Microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Bufford, Daniel C.; Stauffer, Douglas; Mook, William M.; Syed Asif, S. A.; Boyce, Brad L.; Hattar, Khalid

    2016-06-28

    One of the most common causes of structural failure in metals is fatigue induced by cyclic loading. Historically, microstructure-level analysis of fatigue cracks has primarily been performed post mortem. However, such investigations do not directly reveal the internal structural processes at work near micro- and nanoscale fatigue cracks and thus do not provide direct evidence of active microstructural mechanisms. In this paper, the tension–tension fatigue behavior of nanocrystalline Cu was monitored in real time at the nanoscale by utilizing a new capability for quantitative cyclic mechanical loading performed in situ in a transmission electron microscope (TEM). Controllable loads were appliedmore » at frequencies from one to several hundred hertz, enabling accumulations of 106 cycles within 1 h. The nanometer-scale spatial resolution of the TEM allows quantitative fatigue crack growth studies at very slow crack growth rates, measured here at ~10–12 m·cycle–1. This represents an incipient threshold regime that is well below the tensile yield stress and near the minimum conditions for fatigue crack growth. Evidence of localized deformation and grain growth within 150 nm of the crack tip was observed by both standard imaging and precession electron diffraction orientation mapping. Finally, these observations begin to reveal with unprecedented detail the local microstructural processes that govern damage accumulation, crack nucleation, and crack propagation during fatigue loading in nanocrystalline Cu.« less

  11. Remote control of a scanning electron microscope aperture and gun alignment

    DOE Patents [OSTI]

    Cramer, Charles E.; Campchero, Robert J.

    2003-10-07

    This invention relates to a remote control system which through gear motors coupled to the scanning electron microscope (SEM) manual control knobs readily permits remote adjustments as necessary.

  12. Apparatus and methods for controlling electron microscope stages

    DOE Patents [OSTI]

    Duden, Thomas

    2015-08-11

    Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive control sphere based at least in part on the received crystal parameters and that is rotatable by a user to different sphere orientations is presented. The sphere includes a plurality of stage coordinates that correspond to a plurality of positions of the stage and a plurality of crystallographic pole coordinates that correspond to a plurality of polar orientations of the crystal sample. Movement of the sphere causes movement of the stage, wherein the stage coordinates move in conjunction with the crystallographic coordinates represented by pole positions so as to show a relationship between stage positions and the pole positions.

  13. An ultrafast electron microscope gun driven by two-photon photoemission from a nanotip cathode

    SciTech Connect (OSTI)

    Bormann, Reiner; Strauch, Stefanie; Schäfer, Sascha Ropers, Claus

    2015-11-07

    We experimentally and numerically investigate the performance of an advanced ultrafast electron source, based on two-photon photoemission from a tungsten needle cathode incorporated in an electron microscope gun geometry. Emission properties are characterized as a function of the electrostatic gun settings, and operating conditions leading to laser-triggered electron beams of very low emittance (below 20 nm mrad) are identified. The results highlight the excellent suitability of optically driven nano-cathodes for the further development of ultrafast transmission electron microscopy.

  14. Analysis with electron microscope of multielement samples using pure element standards

    DOE Patents [OSTI]

    King, W.E.

    1986-01-06

    This disclosure describes a method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons. Simultaneously the electron dosage and x-ray intensities are measured for each sample of element to determine a ''K/sub AB/'' value to be used in the equation (I/sub A/I/sub B/) = K/sub AB/ (C/sub A//C/sub B/), where I is intensity and C is concentration for elements A and B. The multielement sample is exposed to determine the concentrations of the elements in the sample.

  15. Analysis with electron microscope of multielement samples using pure element standards

    DOE Patents [OSTI]

    King, Wayne E.

    1987-01-01

    A method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons, simultaneously measuring the electron dosage and x-ray intensities for each sample of element to determine a "K.sub.AB " value to be used in the equation ##EQU1## where I is intensity and C is concentration for elements A and B, and exposing the multielement sample to determine the concentrations of the elements in the sample.

  16. Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope

    SciTech Connect (OSTI)

    de Jonge, Niels

    2010-08-17

    A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.

  17. The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory

    SciTech Connect (OSTI)

    Peterson, Randolph S.; Berggren, Karl K.; Mondol, Mark

    2011-06-01

    Few universities or colleges have an accelerator for use with advanced physics laboratories, but many of these institutions have a scanning electron microscope (SEM) on site, often in the biology department. As an accelerator for the undergraduate, advanced physics laboratory, the SEM is an excellent substitute for an ion accelerator. Although there are no nuclear physics experiments that can be performed with a typical 30 kV SEM, there is an opportunity for experimental work on accelerator physics, atomic physics, electron-solid interactions, and the basics of modern e-beam lithography.

  18. Concurrent in situ ion irradiation transmission electron microscope

    SciTech Connect (OSTI)

    Hattar, K.; Bufford, D. C.; Buller, D. L.

    2014-08-29

    An in situ ion irradiation transmission electron microscope has been developed and is operational at Sandia National Laboratories. This facility permits high spatial resolution, real time observation of electron transparent samples under ion irradiation, implantation, mechanical loading, corrosive environments, and combinations thereof. This includes the simultaneous implantation of low-energy gas ions (0.830 keV) during high-energy heavy ion irradiation (0.848 MeV). In addition, initial results in polycrystalline gold foils are provided to demonstrate the range of capabilities.

  19. Damage-free vibrational spectroscopy of biological materials in the electron microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Rez, Peter; Aoki, Toshihiro; March, Katia; Gur, Dvir; Krivanek, Ondrej L.; Dellby, Niklas; Lovejoy, Tracy C.; Wolf, Sharon G.; Cohen, Hagai

    2016-03-10

    Vibrational spectroscopy in the electron microscope would be transformative in the study of biological samples, provided that radiation damage could be prevented. However, electron beams typically create high-energy excitations that severely accelerate sample degradation. Here this major difficulty is overcome using an ‘aloof’ electron beam, positioned tens of nanometres away from the sample: high-energy excitations are suppressed, while vibrational modes of energies o1 eV can be ‘safely’ investigated. To demonstrate the potential of aloof spectroscopy, we record electron energy loss spectra from biogenic guanine crystals in their native state, resolving their characteristic C–H, N–H and C=O vibrational signatures with nomore » observable radiation damage. Furthermore, the technique opens up the possibility of non-damaging compositional analyses of organic functional groups, including non-crystalline biological materials, at a spatial resolution of ~10nm, simultaneously combined with imaging in the electron microscope.« less

  20. Achieving atomic resolution magnetic dichroism by controlling the phase symmetry of an electron probe

    SciTech Connect (OSTI)

    Rusz, Jan; Idrobo, Juan -Carlos; Bhowmick, Somnath

    2014-09-30

    The calculations presented here reveal that an electron probe carrying orbital angular momentum is just a particular case of a wider class of electron beams that can be used to measure electron magnetic circular dichroism (EMCD) with atomic resolution. It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning transmission electron microscope. The probe’s required phase distribution depends on the sample’s magnetic symmetry and crystal structure. The calculations indicate that EMCD signals that use the electron probe’s phase are as strong as those obtained by nanodiffraction methods.

  1. Achieving atomic resolution magnetic dichroism by controlling the phase symmetry of an electron probe

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Rusz, Jan; Idrobo, Juan -Carlos; Bhowmick, Somnath

    2014-09-30

    The calculations presented here reveal that an electron probe carrying orbital angular momentum is just a particular case of a wider class of electron beams that can be used to measure electron magnetic circular dichroism (EMCD) with atomic resolution. It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning transmission electron microscope. The probe’s required phase distribution depends on the sample’s magnetic symmetry and crystal structure. The calculations indicate that EMCD signals that use the electron probe’s phase are as strongmore » as those obtained by nanodiffraction methods.« less

  2. High-speed multi-frame dynamic transmission electron microscope image acquisition system with arbitrary timing

    DOE Patents [OSTI]

    Reed, Bryan W.; DeHope, William J.; Huete, Glenn; LaGrange, Thomas B.; Shuttlesworth, Richard M.

    2016-02-23

    An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses each being of a programmable pulse duration, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has a plurality of plates. A control system having a digital sequencer controls the laser and a plurality of switching components, synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to enable programmable pulse durations and programmable inter-pulse spacings.

  3. High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

    DOE Patents [OSTI]

    Reed, Bryan W.; DeHope, William J.; Huete, Glenn; LaGrange, Thomas B.; Shuttlesworth, Richard M.

    2015-10-20

    An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.

  4. Magnetic lens apparatus for a low-voltage high-resolution electron microscope

    DOE Patents [OSTI]

    Crewe, Albert V.

    1996-01-01

    A lens apparatus in which a beam of charged particles of low accelerating voltage is brought to a focus by a magnetic field, the lens being situated behind the target position. The lens comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. The lens apparatus comprises the sole focusing lens for high-resolution imaging in a low-voltage scanning electron microscope.

  5. Sensitivity Analysis of X-ray Spectra from Scanning Electron Microscopes

    SciTech Connect (OSTI)

    Miller, Thomas Martin; Patton, Bruce W.; Weber, Charles F.; Bekar, Kursat B.

    2014-10-01

    The primary goal of this project is to evaluate x-ray spectra generated within a scanning electron microscope (SEM) to determine elemental composition of small samples. This will be accomplished by performing Monte Carlo simulations of the electron and photon interactions in the sample and in the x-ray detector. The elemental inventories will be determined by an inverse process that progressively reduces the difference between the measured and simulated x-ray spectra by iteratively adjusting composition and geometric variables in the computational model. The intended benefit of this work will be to develop a method to perform quantitative analysis on substandard samples (heterogeneous phases, rough surfaces, small sizes, etc.) without involving standard elemental samples or empirical matrix corrections (i.e., true standardless quantitative analysis).

  6. Phase and birefringence aberration correction

    DOE Patents [OSTI]

    Bowers, M.; Hankla, A.

    1996-07-09

    A Brillouin enhanced four wave mixing phase conjugate mirror corrects phase aberrations of a coherent electromagnetic beam and birefringence induced upon that beam. The stimulated Brillouin scattering (SBS) phase conjugation technique is augmented to include Brillouin enhanced four wave mixing (BEFWM). A seed beam is generated by a main oscillator which arrives at the phase conjugate cell before the signal beams in order to initiate the Brillouin effect. The signal beam which is being amplified through the amplifier chain is split into two perpendicularly polarized beams. One of the two beams is chosen to be the same polarization as some component of the seed beam, the other orthogonal to the first. The polarization of the orthogonal beam is then rotated 90{degree} such that it is parallel to the other signal beam. The three beams are then focused into cell containing a medium capable of Brillouin excitation. The two signal beams are focused such that they cross the seed beam path before their respective beam waists in order to achieve BEFWM or the two signal beams are focused to a point or points contained within the focused cone angle of the seed beam to achieve seeded SBS, and thus negate the effects of all birefringent and material aberrations in the system. 5 figs.

  7. Phase and birefringence aberration correction

    DOE Patents [OSTI]

    Bowers, Mark; Hankla, Allen

    1996-01-01

    A Brillouin enhanced four wave mixing phase conjugate mirror corrects phase aberrations of a coherent electromagnetic beam and birefringence induced upon that beam. The stimulated Brillouin scattering (SBS) phase conjugation technique is augmented to include Brillouin enhanced four wave mixing (BEFWM). A seed beam is generated by a main oscillator which arrives at the phase conjugate cell before the signal beams in order to initiate the Brillouin effect. The signal beam which is being amplified through the amplifier chain is split into two perpendicularly polarized beams. One of the two beams is chosen to be the same polarization as some component of the seed beam, the other orthogonal to the first. The polarization of the orthogonal beam is then rotated 90.degree. such that it is parallel to the other signal beam. The three beams are then focused into cell containing a medium capable of Brillouin excitation. The two signal beams are focused such that they cross the seed beam path before their respective beam waists in order to achieve BEFWM or the two signal beams are focused to a point or points contained within the focused cone angle of the seed beam to achieve seeded SBS, and thus negate the effects of all birefringent and material aberrations in the system.

  8. High resolution transmission electron microscopic in-situ observations of plastic deformation of compressed nanocrystalline gold

    SciTech Connect (OSTI)

    Wang, Guoyong; Lian, Jianshe; Jiang, Qing; Sun, Sheng; Zhang, Tong-Yi

    2014-09-14

    Nanocrystalline (nc) metals possess extremely high strength, while their capability to deform plastically has been debated for decades. Low ductility has hitherto been considered an intrinsic behavior for most nc metals, due to the lack of five independent slip systems actively operating during deformation in each nanograin. Here we report in situ high resolution transmission electron microscopic (HRTEM) observations of deformation process of nc gold under compression, showing the excellent ductility of individual and aggregate nanograins. Compression causes permanent change in the profile of individual nanograins, which is mediated by dislocation slip and grain rotation. The high rate of grain boundary sliding and large extent of widely exited grain rotation may meet the boundary compatibility requirements during plastic deformation. The in situ HRTEM observations suggest that nc gold is not intrinsically brittle under compressive loading.

  9. 2013 R&D 100 Award: Movie-mode electron microscope captures nanoscale

    ScienceCinema (OSTI)

    Lagrange, Thomas; Reed, Bryan

    2014-07-21

    A new instrument developed by LLNL scientists and engineers, the Movie Mode Dynamic Transmission Electron Microscope (MM-DTEM), captures billionth-of-a-meter-scale images with frame rates more than 100,000 times faster than those of conventional techniques. The work was done in collaboration with a Pleasanton-based company, Integrated Dynamic Electron Solutions (IDES) Inc. Using this revolutionary imaging technique, a range of fundamental and technologically important material and biological processes can be captured in action, in complete billionth-of-a-meter detail, for the first time. The primary application of MM-DTEM is the direct observation of fast processes, including microstructural changes, phase transformations and chemical reactions, that shape real-world performance of nanostructured materials and potentially biological entities. The instrument could prove especially valuable in the direct observation of macromolecular interactions, such as protein-protein binding and host-pathogen interactions. While an earlier version of the technology, Single Shot-DTEM, could capture a single snapshot of a rapid process, MM-DTEM captures a multiframe movie that reveals complex sequences of events in detail. It is the only existing technology that can capture multiple electron microscopy images in the span of a single microsecond.

  10. Solving the Accelerator-Condenser Coupling Problem in a Nanosecond Dynamic Transmission Electron Microscope

    SciTech Connect (OSTI)

    Reed, B W; LaGrange, T; Shuttlesworth, R M; Gibson, D J; Campbell, G H; Browning, N D

    2009-12-29

    We describe a modification to a transmission electron microscope (TEM) that allows it to briefly (using a pulsed-laser-driven photocathode) operate at currents in excess of 10 mA while keeping the effects of condenser lens aberrations to a minimum. This modification allows real-space imaging of material microstructure with a resolution of order 10 nm over regions several {micro}m across with an exposure time of 15 ns. This is more than 6 orders of magnitude faster than typical video-rate TEM imaging. The key is the addition of a weak magnetic lens to couple the large-diameter high-current beam exiting the accelerator into the acceptance aperture of a conventional TEM condenser lens system. We show that the performance of the system is essentially consistent with models derived from ray tracing and finite element simulations. The instrument can also be operated as a conventional TEM by using the electron gun in a thermionic mode. The modification enables very high electron current densities in {micro}m-sized areas and could also be used in a non-pulsed system for high-throughput imaging and analytical TEM.

  11. Transmission electron microscopic study of pyrochlore to defect-fluorite transition in rare-earth pyrohafnates

    SciTech Connect (OSTI)

    Karthik, Chinnathambi; Center for Advanced Energy Studies, 995 University Blvd, Idaho Falls, ID 83415 ; Anderson, Thomas J.; Gout, Delphine; Ubic, Rick; Center for Advanced Energy Studies, 995 University Blvd, Idaho Falls, ID 83415

    2012-10-15

    A structural transition in rare earth pyrohafnates, Ln{sub 2}Hf{sub 2}O{sub 7} (Ln=Y, La, Pr, Nd, Tb, Dy, Yb and Lu), has been identified. Neutron diffraction showed that the structure transforms from well-ordered pyrochloric to fully fluoritic through the lanthanide series from La to Lu with a corresponding increase in the position parameter x of the 48f (Fd3{sup Macron }m) oxygen site from 0.330 to 0.375. As evidenced by the selected area electron diffraction, La{sub 2}Hf{sub 2}O{sub 7}, Pr{sub 2}Hf{sub 2}O{sub 7} and Nd{sub 2}Hf{sub 2}O{sub 7} exhibited a well-ordered pyrocholoric structure with the presence of intense superlattice spots, which became weak and diffuse (in Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}) before disappearing completely as the series progressed towards the Lu end. High resolution electron microscopic studies showed the breakdown of the pyrochlore ordering in the form of antiphase domains resulting in diffused smoke-like superlattice spots in the case of Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}. - Graphical abstract: Transmission electron microscopic studies showed the ordered pyrochlore to defect fluorite transition in rare-earth pyrohafnates to occur via the formation of anti-phase domains to start with. Highlights: Black-Right-Pointing-Pointer Pyrochlore to fluorite structural transition in rare earth pyrohafnates. Black-Right-Pointing-Pointer La{sub 2}Hf{sub 2}O{sub 7}, Pr{sub 2}Hf{sub 2}O{sub 7} and Nd{sub 2}Hf{sub 2}O{sub 7} showed well ordered pyrochlore structure. Black-Right-Pointing-Pointer Short range ordering in Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}. Black-Right-Pointing-Pointer Break down of pyrochlore ordering due to antiphase boundaries. Black-Right-Pointing-Pointer Rest of the series showed fluoritic structure.

  12. Novel scanning electron microscope bulge test technique integrated with loading function

    SciTech Connect (OSTI)

    Li, Chuanwei; Xie, Huimin E-mail: xiehm@mail.tsinghua.edu.cn; Liu, Zhanwei E-mail: xiehm@mail.tsinghua.edu.cn

    2014-10-15

    Membranes and film-on-substrate structures are critical elements for some devices in electronics industry and for Micro Electro Mechanical Systems devices. These structures are normally at the scale of micrometer or even nanometer. Thus, the measurement for the mechanical property of these membranes poses a challenge over the conventional measurements at macro-scales. In this study, a novel bulge test method is presented for the evaluation of mechanical property of micro thin membranes. Three aspects are discussed in the study: (a) A novel bulge test with a Scanning Electron Microscope system realizing the function of loading and measuring simultaneously; (b) a simplified Digital Image Correlation method for a height measurement; and (c) an imaging distortion correction by the introduction of a scanning Moir method. Combined with the above techniques, biaxial modulus as well as Young's modulus of the polyimide film can be determined. Besides, a standard tensile test is conducted as an auxiliary experiment to validate the feasibility of the proposed method.

  13. Sparse sampling and reconstruction for electron and scanning probe microscope imaging

    DOE Patents [OSTI]

    Anderson, Hyrum; Helms, Jovana; Wheeler, Jason W.; Larson, Kurt W.; Rohrer, Brandon R.

    2015-07-28

    Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.

  14. In-situ optical transmission electron microscope study of exciton phonon replicas in ZnO nanowires by cathodoluminescence

    SciTech Connect (OSTI)

    Yang, Shize; Tian, Xuezeng; Wang, Lifen; Wei, Jiake; Qi, Kuo; Li, Xiaomin; Xu, Zhi E-mail: xdbai@iphy.ac.cn Wang, Wenlong; Zhao, Jimin; Bai, Xuedong E-mail: xdbai@iphy.ac.cn; Wang, Enge E-mail: xdbai@iphy.ac.cn

    2014-08-18

    The cathodoluminescence spectrum of single zinc oxide (ZnO) nanowires is measured by in-situ optical Transmission Electron Microscope. The coupling between exciton and longitudinal optical phonon is studied. The band edge emission varies for different excitation spots. This effect is attributed to the exciton propagation along the c axis of the nanowire. Contrary to free exciton emission, the phonon replicas are well confined in ZnO nanowire. They travel along the c axis and emit at the end surface. Bending strain increases the relative intensity of second order phonon replicas when excitons travel along the c-axis.

  15. Magnetic lens apparatus for use in high-resolution scanning electron microscopes and lithographic processes

    DOE Patents [OSTI]

    Crewe, Albert V. (Dune Acres, IN)

    2000-01-01

    Disclosed are lens apparatus in which a beam of charged particlesis brought to a focus by means of a magnetic field, the lens being situated behind the target position. In illustrative embodiments, a lens apparatus is employed in a scanning electron microscopeas the sole lens for high-resolution focusing of an electron beam, and in particular, an electron beam having an accelerating voltage of from about 10 to about 30,000 V. In one embodiment, the lens apparatus comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. In other embodiments, the lens apparatus comprises a magnetic dipole or virtual magnetic monopole fabricated from a variety of materials, including permanent magnets, superconducting coils, and magnetizable spheres and needles contained within an energy-conducting coil. Multiple-array lens apparatus are also disclosed for simultaneous and/or consecutive imaging of multiple images on single or multiple specimens. The invention further provides apparatus, methods, and devices useful in focusing charged particle beams for lithographic processes.

  16. Real-time studies of battery electrochemical reactions inside a transmission electron microscope.

    SciTech Connect (OSTI)

    Leung, Kevin; Hudak, Nicholas S.; Liu, Yang; Liu, Xiaohua H.; Fan, Hongyou; Subramanian, Arunkumar; Shaw, Michael J.; Sullivan, John Patrick; Huang, Jian Yu

    2012-01-01

    We report the development of new experimental capabilities and ab initio modeling for real-time studies of Li-ion battery electrochemical reactions. We developed three capabilities for in-situ transmission electron microscopy (TEM) studies: a capability that uses a nanomanipulator inside the TEM to assemble electrochemical cells with ionic liquid or solid state electrolytes, a capability that uses on-chip assembly of battery components on to TEM-compatible multi-electrode arrays, and a capability that uses a TEM-compatible sealed electrochemical cell that we developed for performing in-situ TEM using volatile battery electrolytes. These capabilities were used to understand lithiation mechanisms in nanoscale battery materials, including SnO{sub 2}, Si, Ge, Al, ZnO, and MnO{sub 2}. The modeling approaches used ab initio molecular dynamics to understand early stages of ethylene carbonate reduction on lithiated-graphite and lithium surfaces and constrained density functional theory to understand ethylene carbonate reduction on passivated electrode surfaces.

  17. Transmission Electron Microscope In Situ Straining Technique to Directly Observe Defects and Interfaces During Deformation in Magnesium

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Morrow, Benjamin M.; Cerreta, E. K.; McCabe, R. J.; Tomé, C. N.

    2015-05-14

    In-situ straining was used to study deformation behavior of hexagonal close-packed (hcp) metals.Twinning and dislocation motion, both essential to plasticity in hcp materials, were observed.Typically, these processes are characterized post-mortem by examining remnant microstructural features after straining has occurred. By imposing deformation during imaging, direct observation of active deformation mechanisms is possible. This work focuses on straining of structural metals in a transmission electron microscope (TEM), and a recently developed technique that utilizes familiar procedures and equipment to increase ease of experiments. In-situ straining in a TEM presents several advantages over conventional post-mortem characterization, most notably time-resolution of deformation andmore » streamlined identification of active deformation mechanisms. Drawbacks to the technique and applicability to other studies are also addressed. In-situ straining is used to study twin boundary motion in hcp magnesium. A {101¯2} twin was observed during tensile and compressive loading. Twin-dislocation interactions are directly observed. Notably, dislocations are observed to remain mobile, even after multiple interactions with twin boundaries, a result which suggests that Basinki’s dislocation transformation mechanism by twinning is not present in hcp metals. The coupling of in-situ straining with traditional post-mortem characterization yields more detailed information about material behavior during deformation than either technique alone.« less

  18. Transmission Electron Microscope In Situ Straining Technique to Directly Observe Defects and Interfaces During Deformation in Magnesium

    SciTech Connect (OSTI)

    Morrow, Benjamin M.; Cerreta, E. K.; McCabe, R. J.; Tom, C. N.

    2015-05-14

    In-situ straining was used to study deformation behavior of hexagonal close-packed (hcp) metals.Twinning and dislocation motion, both essential to plasticity in hcp materials, were observed.Typically, these processes are characterized post-mortem by examining remnant microstructural features after straining has occurred. By imposing deformation during imaging, direct observation of active deformation mechanisms is possible. This work focuses on straining of structural metals in a transmission electron microscope (TEM), and a recently developed technique that utilizes familiar procedures and equipment to increase ease of experiments. In-situ straining in a TEM presents several advantages over conventional post-mortem characterization, most notably time-resolution of deformation and streamlined identification of active deformation mechanisms. Drawbacks to the technique and applicability to other studies are also addressed. In-situ straining is used to study twin boundary motion in hcp magnesium. A {1012} twin was observed during tensile and compressive loading. Twin-dislocation interactions are directly observed. Notably, dislocations are observed to remain mobile, even after multiple interactions with twin boundaries, a result which suggests that Basinkis dislocation transformation mechanism by twinning is not present in hcp metals. The coupling of in-situ straining with traditional post-mortem characterization yields more detailed information about material behavior during deformation than either technique alone.

  19. Transmission Electron Microscope In Situ Straining Technique to Directly Observe Defects and Interfaces During Deformation in Magnesium

    SciTech Connect (OSTI)

    Morrow, Benjamin M.; Cerreta, E. K.; McCabe, R. J.; Tomé, C. N.

    2015-05-14

    In-situ straining was used to study deformation behavior of hexagonal close-packed (hcp) metals.Twinning and dislocation motion, both essential to plasticity in hcp materials, were observed.Typically, these processes are characterized post-mortem by examining remnant microstructural features after straining has occurred. By imposing deformation during imaging, direct observation of active deformation mechanisms is possible. This work focuses on straining of structural metals in a transmission electron microscope (TEM), and a recently developed technique that utilizes familiar procedures and equipment to increase ease of experiments. In-situ straining in a TEM presents several advantages over conventional post-mortem characterization, most notably time-resolution of deformation and streamlined identification of active deformation mechanisms. Drawbacks to the technique and applicability to other studies are also addressed. In-situ straining is used to study twin boundary motion in hcp magnesium. A {101¯2} twin was observed during tensile and compressive loading. Twin-dislocation interactions are directly observed. Notably, dislocations are observed to remain mobile, even after multiple interactions with twin boundaries, a result which suggests that Basinki’s dislocation transformation mechanism by twinning is not present in hcp metals. The coupling of in-situ straining with traditional post-mortem characterization yields more detailed information about material behavior during deformation than either technique alone.

  20. Electron microscopic evaluation and fission product identification of irradiated TRISO coated particles from the AGR-1 experiment: A preliminary Study

    SciTech Connect (OSTI)

    I J van Rooyen; D E Janney; B D Miller; J L Riesterer; P A Demkowicz

    2012-10-01

    ABSTRACT Post-irradiation examination of coated particle fuel from the AGR-1 experiment is in progress at Idaho National Laboratory and Oak Ridge National Laboratory. In this presentation a brief summary of results from characterization of microstructures in the coating layers of selected irradiated fuel particles with burnup of 11.3% and 19.3% FIMA will be given. The main objective of the characterization were to study irradiation effects, fuel kernel porosity, layer debonding, layer degradation or corrosion, fission-product precipitation, grain sizes, and transport of fission products from the kernels across the TRISO layers. Characterization techniques such as scanning electron microscopy, transmission electron microscopy, energy dispersive spectroscopy, and wavelength dispersive spectroscopy were used. A new approach to microscopic quantification of fission-product precipitates is also briefly demonstrated. The characterization emphasized fission-product precipitates in the SiC-IPyC interface, SiC layer and the fuel-buffer interlayer, and provided significant new insights into mechanisms of fission-product transport. Although Pd-rich precipitates were identified at the SiC-IPyC interlayer, no significant SiC-layer thinning was observed for the particles investigated. Characterization of these precipitates highlighted the difficulty of measuring low concentration Ag in precipitates with significantly higher concentrations of contain Pd and U. Different approaches to resolving this problem are discussed. Possible microstructural differences between particles with high and low releases of Ag particles are also briefly discussed, and an initial hypothesis is provided to explain fission-product precipitate compositions and locations. No SiC phase transformations or debonding of the SiC-IPyC interlayer as a result of irradiation were observed. Lessons learned from the post-irradiation examination are described and future actions are recommended.

  1. Fine precipitation scenarios of AlZnMg(Cu) alloys revealed by advanced atomic-resolution electron microscopy study Part I: Structure determination of the precipitates in AlZnMg(Cu) alloys

    SciTech Connect (OSTI)

    Liu, J.Z.; Chen, J.H.; Yuan, D.W.; Wu, C.L.; Zhu, J.; Cheng, Z.Y.

    2015-01-15

    Although they are among the most important precipitation-hardened materials for industry applications, the high-strength AlZnMg(Cu) alloys have thus far not yet been understood adequately about their underlying precipitation scenarios in relation with the properties. This is partly due to the fact that the structures of a number of different precipitates involved in electron microscopy in association with quantitative image simulations have to be employed; a systematic study of these hardening precipitates in different alloys is also necessary. In Part I of the present study, it is shown that there are five types of structurally different precipitates including the equilibrium η-phase precipitate. Using two state-of-the-art atomic-resolution imaging techniques in electron microscopy in association with quantitative image simulations, we have determined and clarified all the unknown precipitate structures. It is demonstrated that atomic-resolution imaging can directly suggest approximate structure models, whereas quantitative image analysis can refine the structure details that are much smaller than the resolution of the microscope. This combination is crucially important for solving the difficult structure problems of the strengthening precipitates in AlZnMg(Cu) alloys. - Highlights: Part I: • We determine and verify all the key precipitate structures in AlMgZn(Cu) alloys. • We employ aberration-corrected scanning transmission electron microscopy (STEM). • We use aberration-corrected high-resolution TEM (HRTEM) for the investigations. • We obtain atomic-resolution images of the precipitates and model their structures. • We refine all precipitate structures with quantitative image simulation analysis. Part II: • The hardening precipitates in AlZnMg alloys shall be classified into two groups. • Two precipitation scenarios coexist in the alloys. • The precipitation behavior of such an alloy depends on the alloy's composition. • Very detailed phase

  2. Fabrication of large area plasmonic nanoparticle grating structure on silver halide based transmission electron microscope film and its application as a surface enhanced Raman spectroscopy substrate

    SciTech Connect (OSTI)

    Sudheer, Tiwari, P.; Singh, M. N.; Sinha, A. K.; Rai, V. N.; Srivastava, A. K.; Bhartiya, S.; Mukherjee, C.

    2015-08-14

    The plasmonic responses of silver nanoparticle grating structures of different periods made on silver halide based electron microscope film are investigated. Raster scan of the conventional scanning electron microscope (SEM) is used to carry out electron beam lithography for fabricating the plasmonic nanoparticle grating (PNG) structures. Morphological characterization of the PNG structures, carried out by the SEM and the atomic force microscope, indicates that the depth of the groove decreases with a decrease in the grating period. Elemental characterization performed by the energy dispersive spectroscopy and the x-ray diffraction shows the presence of nanoparticles of silver in the PNG grating. The optical characterization of the gratings shows that the localized surface plasmon resonance peak shifts from 366 to 378 nm and broadens with a decrease in grating period from 10 to 2.5 μm. The surface enhanced Raman spectroscopy of the Rhodamine-6G dye coated PNG structure shows the maximum enhancement by two orders of magnitude in comparison to the randomly distributed silver nanoparticles having similar size and shape as the PNG structure.

  3. Fish scale deformation analysis using scanning electron microscope: New potential biomarker in aquatic environmental monitoring of aluminum and iron contamination

    SciTech Connect (OSTI)

    Hidayati, Dewi; Sulaiman, Norela; Othman, Shuhaimi; Ismail, B. S.

    2013-11-27

    Fish scale has the potential to be a rapid biomarker due to its structure and high possibility to come into contact with any pollutant in the aquatic environment. The scale structure consists of osteoblastic cells and other bone materials such as collagen where it is possible to form a molecular complex with heavy metals such as aluminum and iron. Hence, aluminum and iron in water could possibly destroy the scale material and marked as a scale deformation that quantitatively could be analyzed by comparing it to the normal scale structure. Water sampling and fish cage experiment were performed between June and July 2011 in Porong river which represented the water body that has high aluminum and iron contamination. The filtered water samples were preserved and extracted using the acid-mixture procedure prior to measurement of the aluminum and iron concentrations using Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES), while samples for total suspended solid (TSS) analysis were kept at 4 °C in cool-boxes. The scales were cleaned with sterile water, then dehydrated in 30, 50, 70, and 90% ethanol and dried on filter papers. They were then mounted on an aluminum stub and coated with gold in a sputter coater prior to Scanning Electron Microscope (SEM) observation. According to the SEM analysis, it was found that there were several deformations on the scale samples taken from sites that have high concentrations of aluminum and iron i.e. the increasing number of pits, deformation and decreasing number of spherules and ridges while the control scale exhibited the normal features. However, the site with higher TSS and pH indicated lower aluminum effect. A moderate correlation was found between the number of pits with aluminum (r=0.43) and iron (r=0.41) concentrations. Fish scale deformation using SEM analysis can potentially be a rapid biomarker in aquatic monitoring of aluminum and iron contamination. However, the measurement must be accompanied by pH and

  4. Femtosecond photoelectron point projection microscope

    SciTech Connect (OSTI)

    Quinonez, Erik; Handali, Jonathan; Barwick, Brett

    2013-10-15

    By utilizing a nanometer ultrafast electron source in a point projection microscope we demonstrate that images of nanoparticles with spatial resolutions of the order of 100 nanometers can be obtained. The duration of the emission process of the photoemitted electrons used to make images is shown to be of the order of 100 fs using an autocorrelation technique. The compact geometry of this photoelectron point projection microscope does not preclude its use as a simple ultrafast electron microscope, and we use simple analytic models to estimate temporal resolutions that can be expected when using it as a pump-probe ultrafast electron microscope. These models show a significant increase in temporal resolution when comparing to ultrafast electron microscopes based on conventional designs. We also model the microscopes spectroscopic abilities to capture ultrafast phenomena such as the photon induced near field effect.

  5. Nano-scale luminescence characterization of individual InGaN/GaN quantum wells stacked in a microcavity using scanning transmission electron microscope cathodoluminescence

    SciTech Connect (OSTI)

    Schmidt, Gordon Mller, Marcus; Veit, Peter; Bertram, Frank; Christen, Jrgen; Glauser, Marlene; Carlin, Jean-Franois; Cosendey, Gatien; Butt, Raphal; Grandjean, Nicolas

    2014-07-21

    Using cathodoluminescence spectroscopy directly performed in a scanning transmission electron microscope at liquid helium temperatures, the optical and structural properties of a 62 InGaN/GaN multiple quantum well embedded in an AlInN/GaN based microcavity are investigated at the nanometer scale. We are able to spatially resolve a spectral redshift between the individual quantum wells towards the surface. Cathodoluminescence spectral linescans allow directly visualizing the critical layer thickness in the quantum well stack resulting in the onset of plastic relaxation of the strained InGaN/GaN system.

  6. A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization

    SciTech Connect (OSTI)

    Berger, Andrew J. Page, Michael R.; Young, Justin R.; Bhallamudi, Vidya P.; Johnston-Halperin, Ezekiel; Pelekhov, Denis V.; Hammel, P. Chris; Jacob, Jan; Lewis, Jim; Wenzel, Lothar

    2014-12-15

    Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

  7. Future of Electron Scattering and Diffraction

    SciTech Connect (OSTI)

    Hall, Ernest; Stemmer, Susanne; Zheng, Haimei; Zhu, Yimei; Maracas, George

    2014-02-25

    spectroscopy with high spatial resolution without damaging their structure. The strong interaction of electrons with matter allows high-energy electron pulses to gather structural information before a sample is damaged. Electron ScatteringImaging, diffraction, and spectroscopy are the fundamental capabilities of electron-scattering instruments. The DOE BES-funded TEAM (Transmission Electron Aberration-corrected Microscope) project achieved unprecedented sub-atomic spatial resolution in imaging through aberration-corrected transmission electron microscopy. To further advance electron scattering techniques that directly enable groundbreaking science, instrumentation must advance beyond traditional two-dimensional imaging. Advances in temporal resolution, recording the full phase and energy spaces, and improved spatial resolution constitute a new frontier in electron microscopy, and will directly address the BES Grand Challenges, such as to “control the emergent properties that arise from the complex correlations of atomic and electronic constituents” and the “hidden states” “very far away from equilibrium”. Ultrafast methods, such as the pump-probe approach, enable pathways toward understanding, and ultimately controlling, the chemical dynamics of molecular systems and the evolution of complexity in mesoscale and nanoscale systems. Central to understanding how to synthesize and exploit functional materials is having the ability to apply external stimuli (such as heat, light, a reactive flux, and an electrical bias) and to observe the resulting dynamic process in situ and in operando, and under the appropriate environment (e.g., not limited to UHV conditions). To enable revolutionary advances in electron scattering and science, the participants of the workshop recommended three major new instrumental developments: A. Atomic-Resolution Multi-Dimensional Transmission Electron Microscope: This instrument would provide quantitative information over the entire real space

  8. Total energy study of the microscopic structure and electronic properties of tetragonal perovskite SrTiO{sub 3}

    SciTech Connect (OSTI)

    Rubio-Ponce, A.; Olgun, D.

    2014-05-15

    To study the structural and electronic properties of cubic perovskite SrTiO{sub 3} and its stress-induced tetragonal phase, we have performed total energy calculations and studied the effect of oxygen vacancies on the electronic properties of tetragonal perovskite SrTiO{sub 3}. The method used was the relativistic full-potential linearized augmented plane wave (FLAPW) method. To obtain the geometry that minimizes the total energy, we relaxed the internal atomic sites of the tetragonal cell. As a result of this procedure, we have found that the titanium atoms move toward the plane of the vacancy by 0.03 , and the apical oxygen atoms move to the same plane by approximately 0.14 . These results are discussed in comparison with experimental data.

  9. Quantum oscillations in a two-dimensional electron gas at the rocksalt/zincblende interface of PbTe/CdTe (111) heterostructures.

    SciTech Connect (OSTI)

    Zhang, Bingpo; Lu, Ping; Liu, Henan; Jiao, Lin; Ye, Zhenyu; Jaime, M.; Balakirev, F. F.; Yuan, Huiqiu; Wu, Huizhen; Pan, Wei; Zhang, Yong

    2015-06-05

    Quantum oscillations are observed in the 2DEG system at the interface of novel heterostructures, PbTe/CdTe (111), with nearly identical lattice parameters (aPbTe = 0.6462 nm, aCdTe = 0.648 nm) but very different lattice structures (PbTe: rock salt, CdTe: zinc blende). The 2DEG formation mechanism, a mismatch in the bonding configurations of the valence electrons at the interface, is uniquely different from the other known 2DEG systems. The aberration-corrected scanning transmission electron microscope (AC-STEM) characterization indicates an abrupt interface without cation interdiffusion due to a large miscibility gap between the two constituent materials. As a result, electronic transport measurements under magnetic field up to 60 T, with the observation of Landau level filling factor ν = 1, unambiguously reveal a π Berry phase, suggesting the Dirac Fermion nature of the 2DEG at the heterostructure interface, and the PbTe/CdTe heterostructure being a new candidate for 2D topological crystalline insulators.

  10. Quantum oscillations in a two-dimensional electron gas at the rocksalt/zincblende interface of PbTe/CdTe (111) heterostructures

    SciTech Connect (OSTI)

    Zhang, Bingpo; Lu, Ping; Liu, Henan; Jiao, Lin; Ye, Zhenyu; Jaime, M.; Balakirev, F. F.; Yuan, Huiqiu; Wu, Huizhen; Pan, Wei; Zhang, Yong

    2015-06-05

    Quantum oscillations are observed in the 2DEG system at the interface of novel heterostructures, PbTe/CdTe (111), with nearly identical lattice parameters (aPbTe = 0.6462 nm, aCdTe = 0.648 nm) but very different lattice structures (PbTe: rock salt, CdTe: zinc blende). The 2DEG formation mechanism, a mismatch in the bonding configurations of the valence electrons at the interface, is uniquely different from the other known 2DEG systems. The aberration-corrected scanning transmission electron microscope (AC-STEM) characterization indicates an abrupt interface without cation interdiffusion due to a large miscibility gap between the two constituent materials. As a result, electronic transport measurements under magnetic field up to 60 T, with the observation of Landau level filling factor ν = 1, unambiguously reveal a π Berry phase, suggesting the Dirac Fermion nature of the 2DEG at the heterostructure interface, and the PbTe/CdTe heterostructure being a new candidate for 2D topological crystalline insulators.

  11. Quantum oscillations in a two-dimensional electron gas at the rocksalt/zincblende interface of PbTe/CdTe (111) heterostructures

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhang, Bingpo; Lu, Ping; Liu, Henan; Jiao, Lin; Ye, Zhenyu; Jaime, M.; Balakirev, F. F.; Yuan, Huiqiu; Wu, Huizhen; Pan, Wei; et al

    2015-06-05

    Quantum oscillations are observed in the 2DEG system at the interface of novel heterostructures, PbTe/CdTe (111), with nearly identical lattice parameters (aPbTe = 0.6462 nm, aCdTe = 0.648 nm) but very different lattice structures (PbTe: rock salt, CdTe: zinc blende). The 2DEG formation mechanism, a mismatch in the bonding configurations of the valence electrons at the interface, is uniquely different from the other known 2DEG systems. The aberration-corrected scanning transmission electron microscope (AC-STEM) characterization indicates an abrupt interface without cation interdiffusion due to a large miscibility gap between the two constituent materials. As a result, electronic transport measurements under magneticmore » field up to 60 T, with the observation of Landau level filling factor ν = 1, unambiguously reveal a π Berry phase, suggesting the Dirac Fermion nature of the 2DEG at the heterostructure interface, and the PbTe/CdTe heterostructure being a new candidate for 2D topological crystalline insulators.« less

  12. Laboratory-size three-dimensional x-ray microscope with Wolter type I mirror optics and an electron-impact water window x-ray source

    SciTech Connect (OSTI)

    Ohsuka, Shinji; Ohba, Akira; Onoda, Shinobu; Nakamoto, Katsuhiro; Nakano, Tomoyasu; Miyoshi, Motosuke; Soda, Keita; Hamakubo, Takao

    2014-09-15

    We constructed a laboratory-size three-dimensional water window x-ray microscope that combines wide-field transmission x-ray microscopy with tomographic reconstruction techniques, and observed bio-medical samples to evaluate its applicability to life science research fields. It consists of a condenser and an objective grazing incidence Wolter type I mirror, an electron-impact type oxygen Kα x-ray source, and a back-illuminated CCD for x-ray imaging. A spatial resolution limit of around 1.0 line pairs per micrometer was obtained for two-dimensional transmission images, and 1-μm scale three-dimensional fine structures were resolved.

  13. Crystallographic analysis of the solid-state dewetting of polycrystalline gold film using automated indexing in a transmission electron microscope

    SciTech Connect (OSTI)

    Jang, S. A.; Lee, H. J.; Oh, Y. J.; Thompson, C. V.; Ross, C. A.

    2015-12-01

    We analyzed the effect of crystallographic anisotropy on the morphological evolution of a 12-nm-thick gold film during solid-state dewetting at high temperatures using automated indexing tool in a transmission electron microscopy. Dewetting initiated at grain-boundary triple junctions adjacent to large grains resulting from abnormal grain growth driven by (111) texture development. Voids at the junctions developed shapes with faceted edges bounded by low-index crystal planes. The kinetic mobility of the edges varied with the crystal orientation normal to the edges, with a predominance of specific edges with the slowest retraction rates as the annealing time was increased.

  14. X-ray diffraction and electron microscope studies of yttria stabilized zirconia (YSZ) ceramic coatings exposed to vanadia. Master's thesis

    SciTech Connect (OSTI)

    Kondos, K.G.

    1992-09-01

    The U.S. Navy sometimes has the requirement to use low cost fuels containing significant amounts of vanadium and sulfur in gas turbine engines. Unfortunately the yttria stabilized zirconia (YSZ) witch is used as a thermal barrier coating on gas turbine blades can be severely attacked by vanadia. Powders of YSZ containing 8-mol% Y203 and pure zirconia containing various and mounts Of V205 were annealed at 900 deg. C. These were then examined by X-ray diffraction and electron microscopy, as well as single crystals of pure Zro2 and YSZ ( 20% Wt Y203 ) exposed to V205 Melts, to study how the vanadia degrades the YSZ by reacting with the stabilizer to form YVO4 and how the vanadium transforms the cubic and tetragonal YSZ crystal structures to monoclinic which degrades rapidly as a gas turbine blade coating.

  15. The use of the scanning electron microscope in the determination of the mineral composition of Ballachulish slate

    SciTech Connect (OSTI)

    Walsh, Joan A.

    2007-11-15

    Slate is a fine-grained, low-grade metamorphic rock derived from argillaceous sediments or occasionally volcanic ash. Although most slates contain mainly quartz, chlorite and white mica, they vary considerably in their durability, some lasting centuries while others fail after a few years of service. A detailed characterisation of their mineralogy is required for the assessment of performance, and to establish the provenance of a used slate. A combination of methods was used to examine Ballachulish slates; XRD analysis to determine the principal minerals present, XRF analysis to determine the total chemical composition, and scanning electron microscopy to determine the chemical composition of individual minerals. It was found that the white mica in Ballachulish slate is phengite and the chlorite is ripidolite. Feldspar is present as albite and carbonate as ferroan dolomite. Several accessory minerals were also identified, including chloritoid, monzonite and zircon. There was considerable variation in the ratio of the principal minerals, making it impossible to identify used slates by this criterion. Instead, chemical composition of the individual minerals, and possibly key accessory minerals, should be used to determine the provenance of slates.

  16. Low-loss electron energy loss spectroscopy: An atomic-resolution complement to optical spectroscopies and application to graphene

    SciTech Connect (OSTI)

    Kapetanakis, Myron; Zhou, Wu; Oxley, Mark P.; Lee, Jaekwang; Prange, Micah P.; Pennycook, Stephen J.; Idrobo Tapia, Juan Carlos; Pantelides, Sokrates T.

    2015-09-25

    Photon-based spectroscopies have played a central role in exploring the electronic properties of crystalline solids and thin films. They are a powerful tool for probing the electronic properties of nanostructures, but they are limited by lack of spatial resolution. On the other hand, electron-based spectroscopies, e.g., electron energy loss spectroscopy (EELS), are now capable of subangstrom spatial resolution. Core-loss EELS, a spatially resolved analog of x-ray absorption, has been used extensively in the study of inhomogeneous complex systems. In this paper, we demonstrate that low-loss EELS in an aberration-corrected scanning transmission electron microscope, which probes low-energy excitations, combined with a theoretical framework for simulating and analyzing the spectra, is a powerful tool to probe low-energy electron excitations with atomic-scale resolution. The theoretical component of the method combines density functional theory–based calculations of the excitations with dynamical scattering theory for the electron beam. We apply the method to monolayer graphene in order to demonstrate that atomic-scale contrast is inherent in low-loss EELS even in a perfectly periodic structure. The method is a complement to optical spectroscopy as it probes transitions entailing momentum transfer. The theoretical analysis identifies the spatial and orbital origins of excitations, holding the promise of ultimately becoming a powerful probe of the structure and electronic properties of individual point and extended defects in both crystals and inhomogeneous complex nanostructures. The method can be extended to probe magnetic and vibrational properties with atomic resolution.

  17. Low-loss electron energy loss spectroscopy: An atomic-resolution complement to optical spectroscopies and application to graphene

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Kapetanakis, Myron; Zhou, Wu; Oxley, Mark P.; Lee, Jaekwang; Prange, Micah P.; Pennycook, Stephen J.; Idrobo Tapia, Juan Carlos; Pantelides, Sokrates T.

    2015-09-25

    Photon-based spectroscopies have played a central role in exploring the electronic properties of crystalline solids and thin films. They are a powerful tool for probing the electronic properties of nanostructures, but they are limited by lack of spatial resolution. On the other hand, electron-based spectroscopies, e.g., electron energy loss spectroscopy (EELS), are now capable of subangstrom spatial resolution. Core-loss EELS, a spatially resolved analog of x-ray absorption, has been used extensively in the study of inhomogeneous complex systems. In this paper, we demonstrate that low-loss EELS in an aberration-corrected scanning transmission electron microscope, which probes low-energy excitations, combined with amore » theoretical framework for simulating and analyzing the spectra, is a powerful tool to probe low-energy electron excitations with atomic-scale resolution. The theoretical component of the method combines density functional theory–based calculations of the excitations with dynamical scattering theory for the electron beam. We apply the method to monolayer graphene in order to demonstrate that atomic-scale contrast is inherent in low-loss EELS even in a perfectly periodic structure. The method is a complement to optical spectroscopy as it probes transitions entailing momentum transfer. The theoretical analysis identifies the spatial and orbital origins of excitations, holding the promise of ultimately becoming a powerful probe of the structure and electronic properties of individual point and extended defects in both crystals and inhomogeneous complex nanostructures. The method can be extended to probe magnetic and vibrational properties with atomic resolution.« less

  18. News Item

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4, 2016 Time: 11:00 am Speaker: Ondrej Krivanek, Nion Title: Atomic-Resolution and Vibrational Studies of Materials by Aberration-Corrected Scanning Transmission Electron Microscopy Location: 67-3111 Chemla Room Abstract: Aberration-corrected scanning transmission electron microscopes (AC-STEMs) are able to form electron probes as small as 0.5 Å in diameter, and they can image and spectroscopically analyze single atoms in-situ. NCEM and Nion have pioneered many of these advances. Nion's main

  19. Quantitative in-situ scanning electron microscope pull-out experiments and molecular dynamics simulations of carbon nanotubes embedded in palladium

    SciTech Connect (OSTI)

    Hartmann, S., E-mail: steffen.hartmann@etit.tu-chemnitz.de; Blaudeck, T.; Hermann, S.; Wunderle, B. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Hlck, O. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Fraunhofer IZM Berlin, Gustav-Meyer-Allee 25, 13355 Berlin (Germany); Schulz, S. E.; Gessner, T. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Fraunhofer ENAS Chemnitz, Technologie-Campus 3, 09126 Chemnitz (Germany)

    2014-04-14

    In this paper, we present our results of experimental and numerical pull-out tests on carbon nanotubes (CNTs) embedded in palladium. We prepared simple specimens by employing standard silicon wafers, physical vapor deposition of palladium and deposition of CNTs with a simple drop coating technique. An AFM cantilever with known stiffness connected to a nanomanipulation system was utilized inside a scanning electron microscope (SEM) as a force sensor to determine forces acting on a CNT during the pull-out process. SEM-images of the cantilever attached to a CNT have been evaluated for subsequent displacement steps with greyscale correlation to determine the cantilever deflection. We compare the experimentally obtained pull-out forces with values of numerical investigations by means of molecular dynamics and give interpretations for deviations according to material impurities or defects and their influence on the pull-out data. We find a very good agreement of force data from simulation and experiment, which is 17 nN and in the range of 1061 nN, respectively. Our findings contribute to the ongoing research of the mechanical characterization of CNT-metal interfaces. This is of significant interest for the design of future mechanical sensors utilizing the intrinsic piezoresistive effect of CNTs or other future devices incorporating CNT-metal interfaces.

  20. Microscope and method of use

    DOE Patents [OSTI]

    Bongianni, Wayne L.

    1984-01-01

    A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers.

  1. Microscope and method of use

    DOE Patents [OSTI]

    Bongianni, W.L.

    1984-04-17

    A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers. 7 figs.

  2. Solid state optical microscope

    DOE Patents [OSTI]

    Young, Ian T.

    1983-01-01

    A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

  3. Solid state optical microscope

    DOE Patents [OSTI]

    Young, I.T.

    1983-08-09

    A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal. 2 figs.

  4. Direct observation of the structural and electronic changes of Li{sub 2}MnO{sub 3} during electron irradiation

    SciTech Connect (OSTI)

    Phillips, Patrick J.; Klie, Robert F. [Department of Physics, University of Illinois at Chicago, Chicago, Illinois 60607 (United States); Iddir, Hakim [Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, Illinois 60439 (United States); Abraham, Daniel P. [Argonne National Laboratory, Chemical Sciences and Engineering, 9700 S. Cass Avenue, Argonne, Illinois 60439 (United States)

    2014-09-15

    This study focuses on the effects of electron beam induced irradiation to the layered oxide Li{sub 2}MnO{sub 3}. Aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy are used to characterize structural and electronic transitions in the material during irradiation, with a focus on changes in Mn valence and O content. This truly in situ irradiation allows for specific particle tracking, dose quantification, and real-time observation, while demonstrating many parallels to the oxide's structure evolution observed during electrochemical cycling. Furthermore, it is demonstrated that typical imaging conditions are not severe enough to induce damage to the pristine oxide.

  5. Chromatic-aberration-corrected diffractive lenses for ultra-broadband...

    Office of Scientific and Technical Information (OSTI)

    ... Utah, Salt Lake City, UT 84112, USA. Correspondence and requests for materials should be ... J. A. & Menon, R. Design and analysis of multi-wavelength diffractive optics. ...

  6. Chromatic-aberration-corrected diffractive lenses for ultra-broadband...

    Office of Scientific and Technical Information (OSTI)

    Additional Journal Information: Journal Volume: 6; Journal ID: ISSN 2045-2322 Publisher: Nature Publishing Group Research Org: Univ. of Utah, Salt Lake City, UT (United States) ...

  7. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2010-07-13

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  8. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2009-11-10

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of impaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  9. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2007-12-11

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  10. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2010-06-29

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  11. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2009-10-27

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  12. Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy

    SciTech Connect (OSTI)

    Kovacs, Andras; Ney, A.; Duchamp, Martial; Ney, V.; Boothroyd, Chris; Galindo, Pedro L.; Kaspar, Tiffany C.; Chambers, Scott A.; Dunin-Borkowski, Rafal

    2013-12-23

    We have studied planar defects in epitaxial Co:ZnO dilute magnetic semiconductor thin films deposited on c-plane sapphire (Al2O3) and the Co:ZnO/Al2O3 interface structure at atomic resolution using aberration-corrected transmission electron microscopy (TEM) and electron energy-loss spectroscopy (EELS). Comparing Co:ZnO samples deposited by pulsed laser deposition and reactive magnetron sputtering, both exhibit extrinsic stacking faults, incoherent interface structures, and compositional variations within the first 3-4 Co:ZnO layers at the interface.. In addition, we have measured the local strain which reveals the lattice distortion around the stacking faults.

  13. Nikon PTIPHOT-88 Optical Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    OPTIPHOT-88 Optical Microscope micro1.jpg (69171 bytes)

  14. Cryogenic immersion microscope

    DOE Patents [OSTI]

    Le Gros, Mark; Larabell, Carolyn A.

    2010-12-14

    A cryogenic immersion microscope whose objective lens is at least partially in contact with a liquid reservoir of a cryogenic liquid, in which reservoir a sample of interest is immersed is disclosed. When the cryogenic liquid has an index of refraction that reduces refraction at interfaces between the lens and the sample, overall resolution and image quality are improved. A combination of an immersion microscope and x-ray microscope, suitable for imaging at cryogenic temperatures is also disclosed.

  15. Frontiers of in situ electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by inmore » this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.« less

  16. A method for measuring the local gas pressure within a gas-flow stage in situ in the transmission electron microscope

    SciTech Connect (OSTI)

    Colby, Robert J.; Alsem, Daan H.; Liyu, Andrey V.; Kabius, Bernd C.

    2015-06-01

    The development of environmental transmission electron microscopy (TEM) has enabled in situ experiments in a gaseous environment with high resolution imaging and spectroscopy. Addressing scientific challenges in areas such as catalysis, corrosion, and geochemistry can require pressures much higher than the ~20 mbar achievable with a differentially pumped, dedicated environmental TEM. Gas flow stages, in which the environment is contained between two semi-transparent thin membrane windows, have been demonstrated at pressures of several atmospheres. While this constitutes significant progress towards operando measurements, the design of many current gas flow stages is such that the pressure at the sample cannot necessarily be directly inferred from the pressure differential across the system. Small differences in the setup and design of the gas flow stage can lead to very different sample pressures. We demonstrate a method for measuring the gas pressure directly, using a combination of electron energy loss spectroscopy and TEM imaging. This method requires only two energy filtered TEM images, limiting the measurement time to a few seconds and can be performed during an ongoing experiment at the region of interest. This approach provides a means to ensure reproducibility between different experiments, and even between very differently designed gas flow stages.

  17. A high-resolution field-emission-gun, scanning electron microscope investigation of anisotropic hydrogen decrepitation in Nd-Fe-B-based sintered magnets

    SciTech Connect (OSTI)

    Soderznik, Marko; McGuiness, Paul; Zuzek-Rozman, Kristina; Kobe, Spomenka; Skulj, Irena; Yan Gaolin

    2010-05-15

    In this investigation commercial magnets based on (Nd,Dy){sub 14}(Fe,Co){sub 79}B{sub 7} were prepared by a conventional powder-metallurgy route with a degree of alignment equal to {approx}90% and then exposed to hydrogen at a pressure of 1 bar. The magnets, in the form of cylinders, were observed to decrepitate exclusively from the ends. High-resolution electron microscopy was able to identify the presence of crack formation within the Nd{sub 2}Fe{sub 14}B grains, with the cracks running parallel to the c axis of these grains. Based on the concentration profile for hydrogen in a rare-earth transition-metal material, it is clear that the presence of hydrogen-induced cracks running perpendicular to the ends of the magnet provides for a much more rapidly progressing hydrogen front in this direction than from the sides of the magnet. This results in the magnet exhibiting a macroscopic tendency to decrepitate from the poles of the magnet toward the center. This combination of microstructural modification via particle alignment as part of the sintering process and direct observation via high-resolution electron microscopy has led to a satisfying explanation for the anisotropic hydrogen-decrepitation effect.

  18. Comparative electron microscopic study of chromosomes and interphase nuclei in cells of Cyclops kolensis (Copepoda, Crustacea) before and after chromatin diminution

    SciTech Connect (OSTI)

    Grishanin, A.K.

    1995-05-01

    Using light and electron microscopy, several characteristics of the interphase nuclei and mitotic chromosomes in embryonic cells Cyclops kolensis (Lill) before and after chromatin diminution were studied. We detected a reduction, as a result of chromatin diminution, of one of the two nucleoli in somatic cells. However, the ratio of the total diameter of the nucleoli to the diameter of the nucleus or to the diameter of the cell remained unchanged. Granules of the chromatin to be eliminated became visible in the somatic cells of the C. kolensis embryos at the interphase of the fourth cleavage division. The structure of interphase nuclei and mitotic chromosomes of somatic cells of C. kolensis embryos is different before and after chromatin diminution. Possible mechanisms underlying these differences are discussed. 13 refs., 6 figs., 1 tab.

  19. Solid-state optical microscope

    DOE Patents [OSTI]

    Young, I.T.

    1981-01-07

    A solid state optical microscope is described wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. Means for scanning in one of two orthogonal directions are provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

  20. Microscope collision protection apparatus

    DOE Patents [OSTI]

    DeNure, Charles R.

    2001-10-23

    A microscope collision protection apparatus for a remote control microscope which protects the optical and associated components from damage in the event of an uncontrolled collision with a specimen, regardless of the specimen size or shape. In a preferred embodiment, the apparatus includes a counterbalanced slide for mounting the microscope's optical components. This slide replaces the rigid mounts on conventional upright microscopes with a precision ball bearing slide. As the specimen contacts an optical component, the contacting force will move the slide and the optical components mounted thereon. This movement will protect the optical and associated components from damage as the movement causes a limit switch to be actuated, thereby stopping all motors responsible for the collision.

  1. Infrared microscope inspection apparatus

    DOE Patents [OSTI]

    Forman, S.E.; Caunt, J.W.

    1985-02-26

    Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.

  2. Infrared microscope inspection apparatus

    DOE Patents [OSTI]

    Forman, Steven E.; Caunt, James W.

    1985-02-26

    Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface.

  3. Acoustic imaging microscope

    DOE Patents [OSTI]

    Deason, Vance A.; Telschow, Kenneth L.

    2006-10-17

    An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

  4. Ion photon emission microscope

    DOE Patents [OSTI]

    Doyle, Barney L.

    2003-04-22

    An ion beam analysis system that creates microscopic multidimensional image maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the ion-induced photons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted photons are collected in the lens system of a conventional optical microscope, and projected on the image plane of a high resolution single photon position sensitive detector. Position signals from this photon detector are then correlated in time with electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these photons initially.

  5. Atomic Force Microscope

    SciTech Connect (OSTI)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  6. Low frequency acoustic microscope

    DOE Patents [OSTI]

    Khuri-Yakub, Butrus T.

    1986-11-04

    A scanning acoustic microscope is disclosed for the detection and location of near surface flaws, inclusions or voids in a solid sample material. A focused beam of acoustic energy is directed at the sample with its focal plane at the subsurface flaw, inclusion or void location. The sample is scanned with the beam. Detected acoustic energy specularly reflected and mode converted at the surface of the sample and acoustic energy reflected by subsurface flaws, inclusions or voids at the focal plane are used for generating an interference signal which is processed and forms a signal indicative of the subsurface flaws, inclusions or voids.

  7. The Future of Electron Microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei

    2015-05-06

    Berkeley Lab scientist Haimei Zheng discusses the future of electron microscopy and her breakthrough research into examining liquids using an electron microscope.

  8. Imaging arrangement and microscope

    DOE Patents [OSTI]

    Pertsinidis, Alexandros; Chu, Steven

    2015-12-15

    An embodiment of the present invention is an imaging arrangement that includes imaging optics, a fiducial light source, and a control system. In operation, the imaging optics separate light into first and second tight by wavelength and project the first and second light onto first and second areas within first and second detector regions, respectively. The imaging optics separate fiducial light from the fiducial light source into first and second fiducial light and project the first and second fiducial light onto third and fourth areas within the first and second detector regions, respectively. The control system adjusts alignment of the imaging optics so that the first and second fiducial light projected onto the first and second detector regions maintain relatively constant positions within the first and second detector regions, respectively. Another embodiment of the present invention is a microscope that includes the imaging arrangement.

  9. Electron

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    density measurement by differential interferometry W. X. Ding, D. L. Brower, B. H. Deng, and T. Yates Electrical Engineering Department, University of California-Los Angeles, Los Angeles, California 90095 ͑Received 5 May 2006; presented on 10 May 2006; accepted 16 June 2006; published online 26 September 2006͒ A novel differential interferometer is being developed to measure the electron density gradient and its fluctuations. Two separate laser beams with slight spatial offset and frequency

  10. Electron

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron thermal transport within magnetic islands in the reversed-field pinch a... H. D. Stephens, 1,b͒ D. J. Den Hartog, 1,3 C. C. Hegna, 1,2 and J. A. Reusch 1 1 Department of Physics, University of Wisconsin-Madison, 1150 University Ave., Madison, Wisconsin 53706, USA 2 Department of Engineering Physics, University of Wisconsin-Madison, 1500 Engineering Drive, Madison, Wisconsin 53706, USA 3 Center for Magnetic Self-Organization in Laboratory and Astrophysical Plasmas, University of

  11. Scientists View Battery Under Microscope

    SciTech Connect (OSTI)

    2015-04-10

    PNNL researchers use a special microscope setup that shows the inside of a battery as it charges and discharges. This battery-watching microscope is located at EMSL, DOE's Environmental Molecular Sciences Laboratory that resides at PNNL. Researchers the world over can visit EMSL and use special instruments like this, many of which are the only one of their kind available to scientists.

  12. HIGH TEMPERATURE MICROSCOPE AND FURNACE

    DOE Patents [OSTI]

    Olson, D.M.

    1961-01-31

    A high-temperature microscope is offered. It has a reflecting optic situated above a molten specimen in a furnace and reflecting the image of the same downward through an inert optic member in the floor of the furnace, a plurality of spaced reflecting plane mirrors defining a reflecting path around the furnace, a standard microscope supported in the path of and forming the end terminus of the light path.

  13. Microscopic Description of Induced Nuclear Fission (Conference...

    Office of Scientific and Technical Information (OSTI)

    Microscopic Description of Induced Nuclear Fission Citation Details In-Document Search Title: Microscopic Description of Induced Nuclear Fission You are accessing a document ...

  14. Fourth Fridays Downtown - Under the Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    the Microscope: Explore the natural world through the eyes of microscopes. Examine pond water, plants, fibers, pollen, and more. August 28 - Robotics Night at the Museum: Try...

  15. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Disorder-Induced Microscopic Magnetic Memory Print Wednesday, 26 October 2005 00:00 The magnetic-recording industry deliberately...

  16. Nanodomain induced anomalous magnetic and electronic transport properties of LaBaCo{sub 2}O{sub 5.5+?} highly epitaxial thin films

    SciTech Connect (OSTI)

    Ruiz-Zepeda, F.; Ma, C.; Bahena Uribe, D.; Cantu-Valle, J.; Wang, H.; Xu, Xing; Yacaman, M. J.; Ponce, A.; Chen, C.; Lorenz, B.; Jacobson, A. J.; Chu, P. C. W.

    2014-01-14

    A giant magnetoresistance effect (?46% at 20?K under 7?T) and anomalous magnetic properties were found in a highly epitaxial double perovskite LaBaCo{sub 2}O{sub 5.5+?} (LBCO) thin film on (001) MgO. Aberration-corrected Electron Microscopy and related analytical techniques were employed to understand the nature of these unusual physical properties. The as-grown film is epitaxial with the c-axis of the LBCO structure lying in the film plane and with an interface relationship given by (100){sub LBCO} || (001){sub MgO} and [001]{sub LBCO} || [100]{sub MgO} or [010]{sub MgO}. Orderly oxygen vacancies were observed by line profile electron energy loss spectroscopy and by atomic resolution imaging. Especially, oxygen vacancy and nanodomain structures were found to have a crucial effect on the electronic transport and magnetic properties.

  17. Long working distance interference microscope

    DOE Patents [OSTI]

    Sinclair, Michael B.; DeBoer, Maarten P.; Smith, Norman F.

    2004-04-13

    Disclosed is a long working distance interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. The long working distance of 10-30 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-D height profiles of MEMS test structures to be acquired across an entire wafer. A well-matched pair of reference/sample objectives is not required, significantly reducing the cost of this microscope, as compared to a Linnik microinterferometer.

  18. Surface determination through atomically resolved secondary-electron imaging

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ciston, J.; Brown, H. G.; D’Alfonso, A. J.; Koirala, P.; Ophus, C.; Lin, Y.; Suzuki, Y.; Inada, H.; Zhu, Y.; Allen, L. J.; et al

    2015-06-17

    We report that unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we show a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 x 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our workmore » reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Lastly, dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.« less

  19. Scanning Tunneling Microscope Data Acquistion and Control System

    Energy Science and Technology Software Center (OSTI)

    1995-02-01

    SHOESCAN is a PC based code that acquires and displays data for Scanning Tunneling Microscopes (STM). SHOESCAN interfaces with the STM through external electronic feedback and raster control circuits that are controlled by I/O boards on the PC bus. Data is displayed on a separate color monitor that is interfaced to the PC through an additional frame-grabber board. SHOESCAN can acquire a wide range of surface topographic information as well as surface electronic structure information.

  20. Scanning tunneling microscope nanoetching method

    DOE Patents [OSTI]

    Li, Yun-Zhong; Reifenberger, Ronald G.; Andres, Ronald P.

    1990-01-01

    A method is described for forming uniform nanometer sized depressions on the surface of a conducting substrate. A tunneling tip is used to apply tunneling current density sufficient to vaporize a localized area of the substrate surface. The resulting depressions or craters in the substrate surface can be formed in information encoding patterns readable with a scanning tunneling microscope.

  1. Hyperbaric Hydrothermal Atomic Force Microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2003-07-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  2. Hyperbaric hydrothermal atomic force microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2002-01-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  3. NREL: Measurements and Characterization - Scanning Electron Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Researcher using field-emission scanning electron microscope. Field emission scanning electron microscope (FE-SEM) JEOL 6320F. This FE-SEM equipped with a cold field-emission source and in-lens detectors is designed for ultra-high resolution at low accelerating voltage. Compositional mapping by energy-dispersive microscopy and Electron Backscattered Diffraction are available. In basic scanning electron microscopy (SEM), a beam of highly energetic (0.1-50 keV) electrons is

  4. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2006-08-22

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  5. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2003-01-01

    An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

  6. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V.; Wang, Chengpu

    2004-11-16

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  7. Characterization of patinas by means of microscopic techniques

    SciTech Connect (OSTI)

    Vazquez-Calvo, C.

    2007-11-15

    Many stone-made historic buildings have a yellowish layer called 'patina' on their external surface. In some cases, it is due to the natural ageing of the stone caused by chemical-physical reactions between the surface of the stone and the environment, and in other cases it is the result of biological activity. The origin of these patinas can be also be due to ancient protective treatments. The use of organic additives, such as protein-based compounds, in lime or gypsum-based patinas is a traditional technique, which has been used in past centuries for the conservation and protection of stone materials. The thinness of the patinas ensures that microscopic techniques are irreplaceable for their analysis. Optical Microscopy, Fluorescence Microscopy, Scanning Electron Microscopy together with an Energy Dispersive X-ray Spectrometer, and Electron Microprobe are the microscopic techniques used for the characterization of these coverings, providing very useful information on their composition, texture and structure.

  8. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    ... and yttria stabilised zirconia substrates is demonstrated using aberration-corrected scanning transmission electron microscopy combined with electron energy-loss spectroscopy. ...

  9. Cerium reduction at the interface between ceria and yttria-stabilised...

    Office of Scientific and Technical Information (OSTI)

    and yttria stabilised zirconia substrates is demonstrated using aberration-corrected scanning transmission electron microscopy combined with electron energy-loss spectroscopy. ...

  10. Frontiers of in situ electron microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by in this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.

  11. Fourth Fridays Downtown - Under the Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Fourth Fridays Downtown - Under the Microscope Fourth Fridays Downtown - Under the Microscope WHEN: Jul 24, 2015 4:00 PM - 6:00 PM WHERE: Bradbury Science Museum 1350 Central Ave, Los Alamos, NM 87544, USA CONTACT: Jessica Privette 505 667-0375 CATEGORY: Bradbury INTERNAL: Calendar Login Under the Microscope Event Description The museum will be open late until 6pm every Fourth Friday offering extended access to exhibits, special programming, and activities. The Los Alamos Creative District is

  12. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Disorder-Induced Microscopic Magnetic Memory Print Wednesday, 26 October 2005 00:00 The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over

  13. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Schultz, Peter G.; Wei, Tao

    2003-01-01

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  14. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen

    2001-01-01

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  15. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired...

  16. In-situ optical transmission electron microscope study of exciton...

    Office of Scientific and Technical Information (OSTI)

    Authors: Yang, Shize 1 ; Institute of Physics, Chinese Academy of Sciences, Beijing ... Innovation Center of Quantum Matter, Beijing (China) (China) Institute of Physics, ...

  17. New High-Capability Solid-State Electron Microscope Detector...

    Office of Science (SC) Website

    ... as a collaboration between SMG's group and Area Detector Systems Corp. (Poway, CA) under ... Collaborations, Non-DOE Interagency Collaboration Last modified: 7262016 9:51:05

  18. Robotic CCD microscope for enhanced crystal recognition

    DOE Patents [OSTI]

    Segelke, Brent W.; Toppani, Dominique

    2007-11-06

    A robotic CCD microscope and procedures to automate crystal recognition. The robotic CCD microscope and procedures enables more accurate crystal recognition, leading to fewer false negative and fewer false positives, and enable detection of smaller crystals compared to other methods available today.

  19. Surface-structure sensitivity of CeO2 nanocrystals in photocatalysis...

    Office of Scientific and Technical Information (OSTI)

    heterogeneous (photo)catalysis. In this study, using aberration-corrected scanning transmission electron microscopy (STEM), the atomic surface structures of well-defined...

  20. Atomic and electronic structure of the ferroelectric BaTiO{sub 3}/Ge(001) interface

    SciTech Connect (OSTI)

    Fredrickson, Kurt D.; Ponath, Patrick; Posadas, Agham B.; Demkov, Alexander A.; McCartney, Martha R.; Smith, David J.; Aoki, Toshihiro

    2014-06-16

    In this study, we demonstrate the epitaxial growth of BaTiO{sub 3} on Ge(001) by molecular beam epitaxy using a thin Zintl template buffer layer. A combination of density functional theory, atomic-resolution electron microscopy and in situ photoemission spectroscopy is used to investigate the electronic properties and atomic structure of the BaTiO{sub 3}/Ge interface. Aberration-corrected scanning transmission electron micrographs reveal that the Ge(001) 2??1 surface reconstruction remains intact during the subsequent BaTiO{sub 3} growth, thereby enabling a choice to be made between several theoretically predicted interface structures. The measured valence band offset of 2.7?eV matches well with the theoretical value of 2.5?eV based on the model structure for an in-plane-polarized interface. The agreement between the calculated and measured band offsets, which are highly sensitive to the detailed atomic arrangement, indicates that the most likely BaTiO{sub 3}/Ge(001) interface structure has been identified.

  1. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in...

  2. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits...

  3. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  4. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  5. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  6. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  7. X-ray laser microscope apparatus

    DOE Patents [OSTI]

    Suckewer, Szymon; DiCicco, Darrell S.; Hirschberg, Joseph G.; Meixler, Lewis D.; Sathre, Robert; Skinner, Charles H.

    1990-01-01

    A microscope consisting of an x-ray contact microscope and an optical microscope. The optical, phase contrast, microscope is used to align a target with respect to a source of soft x-rays. The source of soft x-rays preferably comprises an x-ray laser but could comprise a synchrotron or other pulse source of x-rays. Transparent resist material is used to support the target. The optical microscope is located on the opposite side of the transparent resist material from the target and is employed to align the target with respect to the anticipated soft x-ray laser beam. After alignment with the use of the optical microscope, the target is exposed to the soft x-ray laser beam. The x-ray sensitive transparent resist material whose chemical bonds are altered by the x-ray beam passing through the target mater GOVERNMENT LICENSE RIGHTS This invention was made with government support under Contract No. De-FG02-86ER13609 awarded by the Department of Energy. The Government has certain rights in this invention.

  8. Atomic and electronic structures of SrTiO3/GaAs heterointerfaces: An 80-kV atomic-resolution electron energy-loss spectroscopy study

    SciTech Connect (OSTI)

    Qiao, Q.; Klie, Robert F; Ogut, Serdar; Idrobo Tapia, Juan C

    2012-01-01

    We have examined the atomic and electronic structures of epitaxially grown, ultrathin SrTiO{sub 3} (100) films on GaAs (001) using 80-kV aberration-corrected atomic-resolution Z-contrast imaging and electron energy-loss spectroscopy (EELS) to develop a fundamental understanding of the interfacial structure-property relationships. We find that the interface is atomically abrupt and no surface reconstruction of the GaAs (001) surface is observed. Using atomic-column resolved EELS, we examine the oxygen vacancy and Ti concentrations in the SrTiO{sub 3} film and across the heterointerface. We show that Ti diffuses into the first few monolayers of GaAs. Using a combination of EELS and first-principles calculations, we present evidence for the formation of As oxides at the interface depending on the thin-film growth conditions. These findings are used to explain the differences in the transport behavior of the films.

  9. Ultrafast chirped optical waveform recorder using a time microscope...

    Office of Scientific and Technical Information (OSTI)

    DOepatents Search Results Ultrafast chirped optical waveform recorder using a time microscope Title: Ultrafast chirped optical waveform recorder using a time microscope A new ...

  10. Ultrafast chirped optical waveform recorder using a time microscope...

    Office of Scientific and Technical Information (OSTI)

    Data Explorer Search Results Ultrafast chirped optical waveform recorder using a time microscope Title: Ultrafast chirped optical waveform recorder using a time microscope A new ...

  11. Microscopic Study Of Alpha + N Bremsstrahlung From Effective...

    Office of Scientific and Technical Information (OSTI)

    Microscopic Study Of Alpha + N Bremsstrahlung From Effective And Realistic Inter-Nucleon Interactions Citation Details In-Document Search Title: Microscopic Study Of Alpha + N ...

  12. Toward Understanding the Microscopic Origin of Nuclear Clustering...

    Office of Scientific and Technical Information (OSTI)

    Toward Understanding the Microscopic Origin of Nuclear Clustering Citation Details In-Document Search Title: Toward Understanding the Microscopic Origin of Nuclear Clustering Open...

  13. Microscopic theory of quantum anomalous Hall effect in graphene...

    Office of Scientific and Technical Information (OSTI)

    Microscopic theory of quantum anomalous Hall effect in graphene Citation Details In-Document Search Title: Microscopic theory of quantum anomalous Hall effect in graphene Authors: ...

  14. Microscopic Description of Nuclear Fission: Fission Barrier Heights...

    Office of Scientific and Technical Information (OSTI)

    Conference: Microscopic Description of Nuclear Fission: Fission Barrier Heights of Even-Even Actinides Citation Details In-Document Search Title: Microscopic Description of Nuclear ...

  15. Highly charged ion based time of flight emission microscope

    DOE Patents [OSTI]

    Barnes, Alan V.; Schenkel, Thomas; Hamza, Alex V.; Schneider, Dieter H.; Doyle, Barney

    2001-01-01

    A highly charged ion based time-of-flight emission microscope has been designed, which improves the surface sensitivity of static SIMS measurements because of the higher ionization probability of highly charged ions. Slow, highly charged ions are produced in an electron beam ion trap and are directed to the sample surface. The sputtered secondary ions and electrons pass through a specially designed objective lens to a microchannel plate detector. This new instrument permits high surface sensitivity (10.sup.10 atoms/cm.sup.2), high spatial resolution (100 nm), and chemical structural information due to the high molecular ion yields. The high secondary ion yield permits coincidence counting, which can be used to enhance determination of chemical and topological structure and to correlate specific molecular species.

  16. Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy

    SciTech Connect (OSTI)

    Kovcs, A.; Duchamp, M.; Boothroyd, C. B.; Dunin-Borkowski, R. E.; Ney, A.; Ney, V.; Galindo, P. L.; Kaspar, T. C.; Chambers, S. A.

    2013-12-28

    We study planar defects in epitaxial Co:ZnO dilute magnetic semiconductor thin films deposited on c-plane sapphire (Al{sub 2}O{sub 3}), as well as the Co:ZnO/Al{sub 2}O{sub 3} interface, using aberration-corrected transmission electron microscopy and electron energy-loss spectroscopy. Co:ZnO samples that were deposited using pulsed laser deposition and reactive magnetron sputtering are both found to contain extrinsic stacking faults, incoherent interface structures, and compositional variations within the first 34 Co:ZnO layers next to the Al{sub 2}O{sub 3} substrate. The stacking fault density is in the range of 10{sup 17} cm{sup ?3}. We also measure the local lattice distortions around the stacking faults. It is shown that despite the relatively high density of planar defects, lattice distortions, and small compositional variation, the Co:ZnO films retain paramagnetic properties.

  17. Macroscopic model of scanning force microscope

    DOE Patents [OSTI]

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  18. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment A Microscopic Double-Slit Experiment Print Wednesday, 29 February 2012 00:00 Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using

  19. Dynamic imaging with electron microscopy

    ScienceCinema (OSTI)

    Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

    2014-05-30

    Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

  20. SLAC All Access: X-ray Microscope

    ScienceCinema (OSTI)

    Nelson, Johanna; Liu, Yijin

    2014-06-13

    SLAC physicists Johanna Nelson and Yijin Liu give a brief overview of the X-ray microscope at the Stanford Synchrotron Radiation Lightsource (SSRL) that is helping improve rechargeable-battery technology by letting researchers peek into the inner workings of batteries as they operate.

  1. Vertically aligned nanostructure scanning probe microscope tips

    DOE Patents [OSTI]

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  2. Fast electron microscopy via compressive sensing

    DOE Patents [OSTI]

    Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

    2014-12-09

    Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

  3. Note: Long-range scanning tunneling microscope for the study of nanostructures on insulating substrates

    SciTech Connect (OSTI)

    Molina-Mendoza, Aday J.; Rodrigo, Jos G.; Rubio-Bollinger, Gabino; Island, Joshua; Burzuri, Enrique; Zant, Herre S. J. van der; Agrat, Nicols; Condensed Matter Physics Center and Instituto Universitario de Ciencia de Materiales Nicols Cabrera, Universidad Autnoma de Madrid, Campus de Cantoblanco, E-28049 Madrid; Instituto Madrileo de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, E-28049 Madrid

    2014-02-15

    The scanning tunneling microscope (STM) is a powerful tool for studying the electronic properties at the atomic level, however, it is of relatively small scanning range and the fact that it can only operate on conducting samples prevents its application to study heterogeneous samples consisting of conducting and insulating regions. Here we present a long-range scanning tunneling microscope capable of detecting conducting micro and nanostructures on insulating substrates using a technique based on the capacitance between the tip and the sample and performing STM studies.

  4. Revealing the atomic and electronic structure of a SrTiO{sub 3}/LaNiO{sub 3}/SrTiO{sub 3} heterostructure interface

    SciTech Connect (OSTI)

    Zhang, Zaoli; Soltan, S.; Schmid, H.; Habermeier, H.-U.; Keimer, B.; Kaiser, U.

    2014-03-14

    The atomic structures of SrTiO{sub 3} (STO)/LaNiO{sub 3} (LNO)/STO heterostructure interfaces were investigated by spherical aberration-corrected (C{sub S}) (scanning) transmission electron microscopy. Atomic displacement and lattice distortion measurements and electron energy loss spectroscopy (EELS) were used to quantitatively analyze the distortion of the interfacial octahedra and the bond length at the interfaces. Combined with high-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy analyses, two distinct interfacial atomic terminating layers are unambiguously determined. Ensuing quantitative HRTEM measurements revealed that the Ni-O bond length in the interfacial octahedral is elongated at the bottom interface (NiO{sub 2}-SrO). Atomic displacement shows structural relaxation effects when crossing the interfaces and lattice distortions across the interface is more pronounced in LNO than in STO. The Ti/O atomic ratio, La and Ti relative atomic ratio as derived by EELS quantification indicate non-stoichiometric composition at the interfaces. Distinct fine structures of Ti-L{sub 2,3} edge and O-K edge at the bottom and top interfaces are observed. By comparison, we are able to estimate Ti valency at both interfaces. Combining the structural distortions and Ti valency, the polar discontinuity and charge transfer at the interfaces are discussed.

  5. Identification of microscopic hole-trapping mechanisms in nitride semiconductors

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    John L. Lyons; Krishnaswamy, Karthik; Luke Gordon; Van de Walle, Chris G.; Anderson, Janotti

    2015-12-17

    Hole trapping has been observed in nitride heterostructure devices, where the Fermi level is in the vicinity of the valence-band maximum. Using hybrid density functional calculations, we examine microscopic mechanisms for hole trapping in GaN and AlN. In a defect-free material, hole trapping does not spontaneously occur, but trapping can occur in the vicinity of impurities, such as C-a common unintentional impurity in nitrides. As a result, using Schrödinger-Poisson simulations, we assess the effects of C-derived hole traps on N-face high-electron mobility transistors, which we find to be more detrimental than the previously proposed interface traps.

  6. Commissioning of the PRIOR proton microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Varentsov, D.; Antonov, O.; Bakhmutova, A.; Barnes, C. W.; Bogdanov, A.; Danly, C. R.; Efimov, S.; Endres, M.; Fertman, A.; Golubev, A. A.; et al

    2016-02-18

    Recently, a new high energy proton microscopy facility PRIOR (Proton Microscope for FAIR Facility for Anti-proton and Ion Research) has been designed, constructed, and successfully commissioned at GSI Helmholtzzentrum für Schwerionenforschung (Darmstadt, Germany). As a result of the experiments with 3.5–4.5 GeV proton beams delivered by the heavy ion synchrotron SIS-18 of GSI, 30 μm spatial and 10 ns temporal resolutions of the proton microscope have been demonstrated. A new pulsed power setup for studying properties of matter under extremes has been developed for the dynamic commissioning of the PRIOR facility. This study describes the PRIOR setup as well asmore » the results of the first static and dynamic protonradiography experiments performed at GSI.« less

  7. Scanning tunneling microscope assembly, reactor, and system

    DOE Patents [OSTI]

    Tao, Feng; Salmeron, Miquel; Somorjai, Gabor A

    2014-11-18

    An embodiment of a scanning tunneling microscope (STM) reactor includes a pressure vessel, an STM assembly, and three spring coupling objects. The pressure vessel includes a sealable port, an interior, and an exterior. An embodiment of an STM system includes a vacuum chamber, an STM reactor, and three springs. The three springs couple the STM reactor to the vacuum chamber and are operable to suspend the scanning tunneling microscope reactor within the interior of the vacuum chamber during operation of the STM reactor. An embodiment of an STM assembly includes a coarse displacement arrangement, a piezoelectric fine displacement scanning tube coupled to the coarse displacement arrangement, and a receiver. The piezoelectric fine displacement scanning tube is coupled to the coarse displacement arrangement. The receiver is coupled to the piezoelectric scanning tube and is operable to receive a tip holder, and the tip holder is operable to receive a tip.

  8. Ultra high frequency imaging acoustic microscope

    DOE Patents [OSTI]

    Deason, Vance A.; Telschow, Kenneth L.

    2006-05-23

    An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

  9. Microscopic analysis of non-equilibrium dynamics in the semiconductor-laser gain medium

    SciTech Connect (OSTI)

    Hader, J.; Moloney, J. V.; Koch, S. W.

    2014-04-14

    Fully microscopic many-body calculations are used to analyze the carrier dynamics in situations where a strong sub-picosecond pulse interacts with an inverted semiconductor quantum well. Electron-electron and electron-phonon scatterings are calculated on a second Born-Markov level. Intra-subband scatterings on a scale of tens of femtoseconds are shown to quickly re-fill the kinetic holes created in the carrier distributions during the pulse amplification. Even for sub-100 fs pulses, this significantly influences the pulse amplification as well as its spectral dependence. Interband scatterings on a few picosecond timescale limit the possibly achievable repetition rate in pulsed semiconductor lasers.

  10. 3D Printed Microscope for Mobile Devices that Cost Pennies

    ScienceCinema (OSTI)

    Erikson, Rebecca; Baird, Cheryl; Hutchinson, Janine

    2015-06-23

    Scientists at PNNL have designed a 3D-printable microscope for mobile devices using pennies worth of plastic and glass materials. The microscope has a wide range of uses, from education to in-the-field science.

  11. Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Microscopic Theory of Fission Citation Details In-Document Search Title: Microscopic Theory of Fission You are accessing a document from the Department of Energy's (DOE) SciTech ...

  12. 3D Printed Microscope for Mobile Devices that Cost Pennies

    SciTech Connect (OSTI)

    Erikson, Rebecca; Baird, Cheryl; Hutchinson, Janine

    2014-09-15

    Scientists at PNNL have designed a 3D-printable microscope for mobile devices using pennies worth of plastic and glass materials. The microscope has a wide range of uses, from education to in-the-field science.

  13. Plasmons in molecules: Microscopic characterization based on orbital transitions and momentum conservation

    SciTech Connect (OSTI)

    Krauter, Caroline M.; Schirmer, Jochen; Pernpointner, Markus; Jacob, Christoph R.; Dreuw, Andreas

    2014-09-14

    In solid state physics, electronic excitations are often classified as plasmons or single-particle excitations. The former class of states refers to collective oscillations of the electron density. The random-phase approximation allows for a quantum-theoretical treatment and a characterization on a microscopic level as a coherent superposition of a large number of particle-hole transitions with the same momentum transfer. However, small systems such as molecules or small nanoclusters lack the basic properties (momentum conservation and uniform exchange interaction) responsible for the formation of plasmons in the solid-state case. Despite an enhanced interest in plasmon-based technologies and an increasing number of studies regarding plasmons in molecules and small nanoclusters, their definition on a microscopic level of theory remains ambiguous. In this work, we analyze the microscopic properties of molecular plasmons in comparison with the homogeneous electron gas as a model system. Subsequently, the applicability of the derived characteristics is validated by analyzing the electronic excitation vectors with respect to orbital transitions for two linear polyenes within second order versions of the algebraic diagrammatic construction scheme for the polarization propagator.

  14. Smart align -- A new tool for robust non-rigid registration of scanning microscope data

    SciTech Connect (OSTI)

    Jones, Lewys; Yang, Hao; Pennycook, Timothy J.; Marshall, Matthew S. J.; Van Aert, Sandra; Browning, Nigel D.; Castell, Martin R.; Nellist, Peter D.

    2015-07-10

    Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the careful alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated.

  15. Smart align -- A new tool for robust non-rigid registration of scanning microscope data

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Jones, Lewys; Yang, Hao; Pennycook, Timothy J.; Marshall, Matthew S. J.; Van Aert, Sandra; Browning, Nigel D.; Castell, Martin R.; Nellist, Peter D.

    2015-07-10

    Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the carefulmore » alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated.« less

  16. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  17. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  18. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  19. Scanning tip microwave near field microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Schultz, Peter G.; Wei, Tao

    1998-01-01

    A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

  20. Scanning tip microwave near field microscope

    DOE Patents [OSTI]

    Xiang, X.D.; Schultz, P.G.; Wei, T.

    1998-10-13

    A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an end wall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity. 17 figs.

  1. Acoustic microscope surface inspection system and method

    DOE Patents [OSTI]

    Khuri-Yakub, Butrus T.; Parent, Philippe; Reinholdtsen, Paul A.

    1991-01-01

    An acoustic microscope surface inspection system and method in which pulses of high frequency electrical energy are applied to a transducer which forms and focuses acoustic energy onto a selected location on the surface of an object and receives energy from the location and generates electrical pulses. The phase of the high frequency electrical signal pulses are stepped with respected to the phase of a reference signal at said location. An output signal is generated which is indicative of the surface of said selected location. The object is scanned to provide output signals representative of the surface at a plurality of surface locations.

  2. Acoustic microscope surface inspection system and method

    DOE Patents [OSTI]

    Khuri-Yakub, B.T.; Parent, P.; Reinholdtsen, P.A.

    1991-02-26

    An acoustic microscope surface inspection system and method are described in which pulses of high frequency electrical energy are applied to a transducer which forms and focuses acoustic energy onto a selected location on the surface of an object and receives energy from the location and generates electrical pulses. The phase of the high frequency electrical signal pulses are stepped with respect to the phase of a reference signal at said location. An output signal is generated which is indicative of the surface of said selected location. The object is scanned to provide output signals representative of the surface at a plurality of surface locations. 7 figures.

  3. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    to the orientation of the electron spin, this resonant scattering process is the quantum analogue of the classical Faraday effect. Coherent x rays, produced by passing them...

  4. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ... of detection technique and advanced modeling into a widely applicable structural tool for electron interferometry and holography by capitalizing on coherent photoemission. ...

  5. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    modeling into a widely applicable structural tool for electron interferometry and holography by capitalizing on coherent photoemission. These multicenter interferences in the...

  6. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    photoionization cross-section would oscillate around a value predicted by the Franck-Condon principle, which governs the likelihood of transitions involving electronic and...

  7. Atomic configuration of irradiation-induced planar defects in 3C-SiC

    SciTech Connect (OSTI)

    Lin, Y. R. [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); National Synchrotron Radiation Center, 101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu 30076, Taiwan (China); Ho, C. Y. [Institute of Nuclear Engineering and Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Hsieh, C. Y.; Chang, M. T.; Lo, S. C. [Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, Taiwan (China); Chen, F. R. [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Kai, J. J., E-mail: ceer0001@gmail.com [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Institute of Nuclear Engineering and Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China)

    2014-03-24

    The atomic configuration of irradiation-induced planar defects in single crystal 3C-SiC at high irradiation temperatures was shown in this research. A spherical aberration corrected scanning transmission electron microscope provided images of individual silicon and carbon atoms by the annular bright-field (ABF) method. Two types of irradiation-induced planar defects were observed in the ABF images including the extrinsic stacking fault loop with two offset Si-C bilayers and the intrinsic stacking fault loop with one offset Si-C bilayer. The results are in good agreement with images simulated under identical conditions.

  8. Imaging individual lanthanum atoms in zeolite Y by scanning transmission electron microscopy: evidence of lanthanum pair sites

    SciTech Connect (OSTI)

    Xu, Pinghong; Lu, Jing; Aydin, C.; Debefve, Louise M.; Browning, Nigel D.; Chen, Cong-Yan; Gates, Bruce C.

    2015-09-01

    Images of La-exchanged NaY zeolite obtained with aberration-corrected scanning transmission electron microscopy (STEM) show that about 80% of the La cations were present as site-isolated species, with the remainder in pair sites. The distance between La cations in the pair sites ranged from 1.44 to 3.84 Å, consistent with the presence of pairs of cations tilted at various angles with respect to the support surface. The actual distance between La cations in the pair sites is inferred to be approximately 3.84 Å, which is shorter than the distance between the nearest Al sites in the zeolite (4.31 Å). The results therefore suggest the presence of dimeric structures of La cations bridged with OH groups, and the presence of such species has been inferred previously on the basis of X-ray photoelectron spectroscopy (W. Grünert, U. Sauerlandt, R. Schlögl, H.G. Karge, J. Phys. Chem., 97 (1993) 1413).

  9. Microscopic origin of volume modulus inflation

    SciTech Connect (OSTI)

    Cicoli, Michele; Muia, Francesco; Pedro, Francisco Gil

    2015-12-21

    High-scale string inflationary models are in well-known tension with low-energy supersymmetry. A promising solution involves models where the inflaton is the volume of the extra dimensions so that the gravitino mass relaxes from large values during inflation to smaller values today. We describe a possible microscopic origin of the scalar potential of volume modulus inflation by exploiting non-perturbative effects, string loop and higher derivative perturbative corrections to the supergravity effective action together with contributions from anti-branes and charged hidden matter fields. We also analyse the relation between the size of the flux superpotential and the position of the late-time minimum and the inflection point around which inflation takes place. We perform a detailed study of the inflationary dynamics for a single modulus and a two moduli case where we also analyse the sensitivity of the cosmological observables on the choice of initial conditions.

  10. Long working distance incoherent interference microscope

    DOE Patents [OSTI]

    Sinclair, Michael B.; De Boer, Maarten P.

    2006-04-25

    A full-field imaging, long working distance, incoherent interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. A long working distance greater than 10 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-dimensional height profiles of MEMS test structures to be acquired across an entire wafer while being actively probed, and, optionally, through a transparent window. An optically identical pair of sample and reference arm objectives is not required, which reduces the overall system cost, and also the cost and time required to change sample magnifications. Using a LED source, high magnification (e.g., 50.times.) can be obtained having excellent image quality, straight fringes, and high fringe contrast.

  11. Three-dimensional scanning confocal laser microscope

    DOE Patents [OSTI]

    Anderson, R. Rox; Webb, Robert H.; Rajadhyaksha, Milind

    1999-01-01

    A confocal microscope for generating an image of a sample includes a first scanning element for scanning a light beam along a first axis, and a second scanning element for scanning the light beam at a predetermined amplitude along a second axis perpendicular to the first axis. A third scanning element scans the light beam at a predetermined amplitude along a third axis perpendicular to an imaging plane defined by the first and second axes. The second and third scanning element are synchronized to scan at the same frequency. The second and third predetermined amplitudes are percentages of their maximum amplitudes. A selector determines the second and third predetermined amplitudes such that the sum of the percentages is equal to one-hundred percent.

  12. Microscopic description of fission dynamics: finite element method...

    Office of Scientific and Technical Information (OSTI)

    Title: Microscopic description of fission dynamics: finite element method resolution of ... This site is a product of DOE's Office of Scientific and Technical Information (OSTI) and ...

  13. Microscopic Study Of Alpha + N Bremsstrahlung From Effective...

    Office of Scientific and Technical Information (OSTI)

    Of Alpha + N Bremsstrahlung From Effective And Realistic Inter-Nucleon Interactions Citation Details In-Document Search Title: Microscopic Study Of Alpha + N Bremsstrahlung ...

  14. Synchrotron radiation infrared microscopic study of non-bridging...

    Office of Scientific and Technical Information (OSTI)

    Title: Synchrotron radiation infrared microscopic study of non-bridging oxygen modes associated with laser-induced breakdown of fused silica Authors: Matthews, M J ; Carr, C W ; ...

  15. Braking system for use with an arbor of a microscope

    DOE Patents [OSTI]

    Norgren, Duane U.

    1984-01-01

    A balanced braking system comprising a plurality of braking assemblies located about a member to be braked. Each of the braking assemblies consists of a spring biased piston of a first material fitted into a body of a different material which has a greater contraction upon cooling than the piston material. The piston is provided with a recessed head portion over which is positioned a diaphragm and forming a space therebetween to which is connected a pressurized fluid supply. The diaphragm is controlled by the fluid in the space to contact or withdraw from the member to be braked. A cooling device causes the body within which the piston is fitted to contract more than the piston, producing a tight shrink fit therebetween. The braking system is particularly applicable for selectively braking an arbor of an electron microscope which immobilizes, for example, a vertically adjustable low temperature specimen holder during observation. The system provides balanced braking forces which can be easily removed and re-established with minimal disturbance to arbor location.

  16. Fine precipitation scenarios of AlZnMg(Cu) alloys revealed by advanced atomic-resolution electron microscopy study Part II: Fine precipitation scenarios in AlZnMg(Cu) alloys

    SciTech Connect (OSTI)

    Liu, J.Z.; Chen, J.H.; Liu, Z.R.; Wu, C.L.

    2015-01-15

    Although they are among the most important precipitation-hardened materials for industry applications, the high-strength AlZnMg(Cu) alloys have thus far not yet been understood adequately about their underlying precipitation scenarios in relation with the properties. This is partly due to the fact that the structures of a number of different precipitates involved in the alloys are unknown, and partly due to the complexity that the precipitation behaviors of the alloys may be closely related to the alloy's composition. In Part I of the present study, we have determined all the unknown precipitate structures in the alloys. Here in Part II, using atomic-resolution electron microscopy in association with the first principles energy calculations, we further studied and correlated the phase/structure transformation/evolution among these hardening precipitates in relation with the alloy's composition. It is shown that there are actually two coexisting classes of hardening precipitates in these alloys: the first class includes the η′-precipitates and their early-stage Guinier–Preston (GP-η′) zones; the second class includes the precursors of the equilibrium η-phase (referred to η{sub p}, or η-precursor) and their early-stage Guinier–Preston (GP-η{sub p}) zones. The two coexisting classes of precipitates correspond to two precipitation scenarios. - Highlights: • We determine and verify all the key precipitate structures in AlMgZn(Cu) alloys. • We employ aberration-corrected scanning transmission electron microscopy (STEM). • We use aberration-corrected high-resolution TEM (HRTEM) for the investigations. • We obtain atomic-resolution images of the precipitates and model their structures. • We refine all precipitate structures with quantitative image simulation analysis. • The hardening precipitates in AlZnMg alloys shall be classified into two groups. • Two precipitation scenarios coexist in the alloys. • The precipitation behavior of such an

  17. In-situ high resolution transmission electron microscopy observation of silicon nanocrystal nucleation in a SiO{sub 2} bilayered matrix

    SciTech Connect (OSTI)

    Yang, T. C.-J. Wu, L.; Lin, Z.; Jia, X.; Puthen-Veettil, B.; Zhang, T.; Conibeer, G.; Perez-Wurfl, I.; Kauffmann, Y.; Rothschild, A.

    2014-08-04

    Solid-state nucleation of Si nanocrystals in a SiO{sub 2} bilayered matrix was observed at temperatures as low as 450?C. This was achieved by aberration corrected high-resolution transmission electron microscopy (HRTEM) with real-time in-situ heating up to 600?C. This technique is a valuable characterization tool especially with the recent interest in Si nanostructures for light emitting devices, non-volatile memories, and third-generation photovoltaics which all typically require a heating step in their fabrication. The control of size, shape, and distribution of the Si nanocrystals are critical for these applications. This experimental study involves in-situ observation of the nucleation of Si nanocrystals in a SiO{sub 2} bilayered matrix fabricated through radio frequency co-sputtering. The results show that the shapes of Si nanocrystals in amorphous SiO{sub 2} bilayered matrices are irregular and not spherical, in contrast to many claims in the literature. Furthermore, the Si nanocrystals are well confined within their layers by the amorphous SiO{sub 2}. This study demonstrates the potential of in-situ HRTEM as a tool to observe the real time nucleation of Si nanocrystals in a SiO{sub 2} bilayered matrix. Furthermore, ideas for improvements on this in-situ heating HRTEM technique are discussed.

  18. High-resolution electron microscopy of advanced materials

    SciTech Connect (OSTI)

    Mitchell, T.E.; Kung, H.H.; Sickafus, K.E.; Gray, G.T. III; Field, R.D.; Smith, J.F.

    1997-11-01

    This final report chronicles a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The High-Resolution Electron Microscopy Facility has doubled in size and tripled in quality since the beginning of the three-year period. The facility now includes a field-emission scanning electron microscope, a 100 kV field-emission scanning transmission electron microscope (FE-STEM), a 300 kV field-emission high-resolution transmission electron microscope (FE-HRTEM), and a 300 kV analytical transmission electron microscope. A new orientation imaging microscope is being installed. X-ray energy dispersive spectrometers for chemical analysis are available on all four microscopes; parallel electron energy loss spectrometers are operational on the FE-STEM and FE-HRTEM. These systems enable evaluation of local atomic bonding, as well as chemical composition in nanometer-scale regions. The FE-HRTEM has a point-to-point resolution of 1.6 {angstrom}, but the resolution can be pushed to its information limit of 1 {angstrom} by computer reconstruction of a focal series of images. HRTEM has been used to image the atomic structure of defects such as dislocations, grain boundaries, and interfaces in a variety of materials from superconductors and ferroelectrics to structural ceramics and intermetallics.

  19. Fragment Yields Calculated in a Time-Dependent Microscopic Theory...

    Office of Scientific and Technical Information (OSTI)

    Fragment Yields Calculated in a Time-Dependent Microscopic Theory of Fission Citation ... Word Cloud More Like This Full Text preview image File size NAView Full Text View Full ...

  20. Long working-distance, incoherent light interference microscope...

    Office of Scientific and Technical Information (OSTI)

    Journal Article: Long working-distance, incoherent light interference microscope Citation ... OSTI Identifier: 973677 Report Number(s): SAND2005-3369J Journal ID: ISSN 0003-6935; ...

  1. The Use of Microscopes and Telescopes in IR Imaging (Conference...

    Office of Scientific and Technical Information (OSTI)

    working in a research environment, where applications can vary from week to week. ... In these cases, the thermographer must rely on an IR microscope for close-up work with a ...

  2. Microscopic Calculation of Fission Fragment Energies for the...

    Office of Scientific and Technical Information (OSTI)

    for the 239Pu(nth,f) Reaction Citation Details In-Document Search Title: Microscopic Calculation of Fission Fragment Energies for the 239Pu(nth,f) Reaction We calculate the ...

  3. A microscopic theory of low energy fission: fragment properties

    Office of Scientific and Technical Information (OSTI)

    (Conference) | SciTech Connect Conference: A microscopic theory of low energy fission: fragment properties Citation Details In-Document Search Title: A microscopic theory of low energy fission: fragment properties Authors: Younes, W ; Gogny, D ; Schunck, N Publication Date: 2013-01-11 OSTI Identifier: 1062214 Report Number(s): LLNL-PROC-609985 DOE Contract Number: W-7405-ENG-48 Resource Type: Conference Resource Relation: Conference: Presented at: Fifth International Conference on Fission

  4. Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Microscopic Theory of Fission Citation Details In-Document Search Title: Microscopic Theory of Fission Authors: Younes, W ; Gogny, D Publication Date: 2008-01-03 OSTI Identifier: 924187 Report Number(s): LLNL-PROC-400347 DOE Contract Number: W-7405-ENG-48 Resource Type: Conference Resource Relation: Conference: Presented at: Compound Nuclear Reactions and Related Topics, Fish Camp, CA, United States, Oct 22 - Oct 26, 2007 Research Org: Lawrence Livermore National Laboratory (LLNL), Livermore, CA

  5. The Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Conference: The Microscopic Theory of Fission Citation Details In-Document Search Title: The Microscopic Theory of Fission Fission-fragment properties have been calculated for thermal neutron-induced fission on a {sup 239}Pu target, using constrained Hartree-Fock-Bogoliubov calculations with a finite-range effective interaction. A quantitative criterion based on the interaction energy between the nascent fragments is introduced to define the scission configurations. The validity of this

  6. Phase contrast in high resolution electron microscopy

    DOE Patents [OSTI]

    Rose, H.H.

    1975-09-23

    This patent relates to a device for developing a phase contrast signal for a scanning transmission electron microscope. The lens system of the microscope is operated in a condition of defocus so that predictable alternate concentric regions of high and low electron density exist in the cone of illumination. Two phase detectors are placed beneath the object inside the cone of illumination, with the first detector having the form of a zone plate, each of its rings covering alternate regions of either higher or lower electron density. The second detector is so configured that it covers the regions of electron density not covered by the first detector. Each detector measures the number of electrons incident thereon and the signal developed by the first detector is subtracted from the signal developed by the record detector to provide a phase contrast signal. (auth)

  7. Electron radiography

    DOE Patents [OSTI]

    Merrill, Frank E.; Morris, Christopher

    2005-05-17

    A system capable of performing radiography using a beam of electrons. Diffuser means receive a beam of electrons and diffuse the electrons before they enter first matching quadrupoles where the diffused electrons are focused prior to the diffused electrons entering an object. First imaging quadrupoles receive the focused diffused electrons after the focused diffused electrons have been scattered by the object for focusing the scattered electrons. Collimator means receive the scattered electrons and remove scattered electrons that have scattered to large angles. Second imaging quadrupoles receive the collimated scattered electrons and refocus the collimated scattered electrons and map the focused collimated scattered electrons to transverse locations on an image plane representative of the electrons' positions in the object.

  8. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    ... It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning ...

  9. Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices...

    Office of Scientific and Technical Information (OSTI)

    Through x-ray absorption near edge spectroscopy and aberration-corrected scanning transmission electron microscopy we show that the Ti cations are displaced off-center in the TiO6 ...

  10. Dynamic microscopic theory of fusion using DC-TDHF

    SciTech Connect (OSTI)

    Umar, A. S.; Oberacker, V. E.; Keser, R.; Maruhn, J. A.; Reinhard, P.-G.

    2012-10-20

    The density-constrained time-dependent Hartree-Fock (DC-TDHF) theory is a fully microscopic approach for calculating heavy-ion interaction potentials and fusion cross sections below and above the fusion barrier. We discuss recent applications of DC-TDHF method to fusion of light and heavy systems.

  11. Microscopic observations of palladium used for cold fusion

    SciTech Connect (OSTI)

    Matsumoto, T. )

    1991-05-01

    This paper examines the microscopic structures of palladium metals used for cold fusion experiments. Tiny spot defects suggesting cold fusion have been observed in grain boundaries as the Nattoh model predicts. The relationship between these defects and a series of neutron busts and an indirect loop of hydrogen chain reactions are discussed.

  12. Laser excited confocal microscope fluorescence scanner and method

    DOE Patents [OSTI]

    Mathies, Richard A.; Peck, Konan

    1992-01-01

    A fluorescent scanner for scanning the fluorescence from a fluorescence labeled separated sample on a sample carrier including a confocal microscope for illuminating a predetermined volume of the sample carrier and/or receiving and processing fluorescence emissions from said volume to provide a display of the separated sample.

  13. Laser excited confocal microscope fluorescence scanner and method

    DOE Patents [OSTI]

    Mathies, R.A.; Peck, K.

    1992-02-25

    A fluorescent scanner is designed for scanning the fluorescence from a fluorescence labeled separated sample on a sample carrier. The scanner includes a confocal microscope for illuminating a predetermined volume of the sample carrier and/or receiving and processing fluorescence emissions from the volume to provide a display of the separated sample. 8 figs.

  14. Reflection soft X-ray microscope and method

    DOE Patents [OSTI]

    Suckewer, S.; Skinner, C.H.; Rosser, R.

    1993-01-05

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  15. Reflection soft X-ray microscope and method

    DOE Patents [OSTI]

    Suckewer, Szymon; Skinner, Charles H.; Rosser, Roy

    1993-01-01

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  16. Scanning Transmission X-ray Microscope Control Program

    Energy Science and Technology Software Center (OSTI)

    2005-08-05

    User Interface and control software or C++ to run on specifically equipped computer running Windows Operating Systems. Program performs specific control functions required to operate Interferometer controlled scanning transmission X-ray microscopes at ALS beamlines 532 and 11.0.2. Graphical user interface facilitates control, display images and spectra.

  17. Neutrinoless double beta decay in the microscopic interacting boson model

    SciTech Connect (OSTI)

    Iachello, F. [Center for Theoretical Physics, Sloane Physics Laboratory Yale University New Haven, CT 06520-8120 (United States)

    2009-11-09

    The results of a calculation of the nuclear matrix elements for neutrinoless double beta decay in the closure approximation in several nuclei within the framework of the microscopic interacting boson model (IBM-2) are presented and compared with those calculated in the shell model (SM) and quasiparticle random phase approximation (QRPA)

  18. A brightness comparison of thermionic electron sources in a TEM

    SciTech Connect (OSTI)

    Cook, R.E.

    1994-03-01

    In the quest for thermionic electron sources brighter than the standard tungsten filament, manufacturers have given us first LaB{sub 6} and then CeB{sub 6} single crystals. This paper compares these 3 electron sources under typical operating conditions in a Philips EM420T transmission microscope.

  19. Spectro-Microscopic Measurements of Carbonaceous Aerosol Aging in Central California

    SciTech Connect (OSTI)

    Moffet, Ryan C.; Rodel, Tobias; Kelly, Stephen T.; Yu, Xiao-Ying; Carroll, Gregory; Fast, Jerome D.; Zaveri, Rahul A.; Laskin, Alexander; Gilles, Mary K.

    2013-10-29

    Carbonaceous aerosols are responsible for large uncertainties in climate models, degraded visibility, and adverse health effects. The Carbonaceous Aerosols and Radiative Effects Study (CARES) was designed to study carbonaceous aerosols in the natural environment of Central Valley, California, and learn more about their atmospheric formation and aging. This paper presents results from spectro-microscopic measurements of carbonaceous particles collected during CARES at the time of pollution accumulation event (June 27-29, 2010), when in situ measurements indicated an increase in the organic carbon content of aerosols as the Sacramento urban plume aged. Computer controlled scanning electron microscopy coupled with an energy dispersive X-ray detector (CCSEM/EDX) and scanning transmission X-ray microscopy coupled with near edge X-ray absorption spectroscopy (STXM/NEXAFS) were used to probe the chemical composition and morphology of individual particles. It was found that the mass of organic carbon on individual particles increased through condensation of secondary organic aerosol. STXM/NEXAFS indicated that the number fraction of homogenous organic particles lacking inorganic inclusions (greater than ~50 nm diameter) increased with plume age as did the organic mass per particle. Comparison of the CARES spectro-microscopic data set with a similar dataset obtained in Mexico City during the MILAGRO campaign showed that individual particles in Mexico City contained twice as much carbon as those sampled during CARES. The number fraction of soot particles at the Mexico City urban site (30%) was larger than at the CARES urban site (10%) and the most aged samples from CARES contained less carbon-carbon double bonds. Differences between carbonaceous particles in Mexico City and California result from different sources, photochemical conditions, gas phase reactants, and secondary organic aerosol precursors. The detailed results provided by these spectro-microscopic measurements

  20. Electron Transfer

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Pierre Kennepohl1,2 and Edward Solomon1* 1Department of Chemistry, Stanford University, Stanford, CA 94305 Electron transfer, or the act of moving an electron from one place to another, is amongst the simplest of chemical processes, yet certainly one of the most critical. The process of efficiently and controllably moving electrons around is one of the primary regulation mechanisms in biology. Without stringent control of electrons in living organisms, life could simply not exist. For example,

  1. Low vibration high numerical aperture automated variable temperature Raman microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Tian, Y.; Reijnders, A. A.; Osterhoudt, G. B.; Valmianski, I.; Ramirez, J. G.; Urban, C.; Zhong, R.; Schneeloch, J.; Gu, G.; Henslee, I.; et al

    2016-04-05

    Raman micro-spectroscopy is well suited for studying a variety of properties and has been applied to wide- ranging areas. Combined with tuneable temperature, Raman spectra can offer even more insights into the properties of materials. However, previous designs of variable temperature Raman microscopes have made it extremely challenging to measure samples with low signal levels due to thermal and positional instability as well as low collection efficiencies. Thus, contemporary Raman microscope has found limited applicability to probing the subtle physics involved in phase transitions and hysteresis. This paper describes a new design of a closed-cycle, Raman microscope with full polarizationmore » rotation. High collection efficiency, thermal and mechanical stability are ensured by both deliberate optical, cryogenic, and mechanical design. Measurements on two samples, Bi2Se3 and V2O3, which are known as challenging due to low thermal conductivities, low signal levels and/or hysteretic effects, are measured with previously undemonstrated temperature resolution.« less

  2. Ion-induced electron emission microscopy

    DOE Patents [OSTI]

    Doyle, Barney L.; Vizkelethy, Gyorgy; Weller, Robert A.

    2001-01-01

    An ion beam analysis system that creates multidimensional maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the secondary electrons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted secondary electrons are collected in a strong electric field perpendicular to the sample surface and (optionally) projected and refocused by the electron lenses found in a photon emission electron microscope, amplified by microchannel plates and then their exact position is sensed by a very sensitive X Y position detector. Position signals from this secondary electron detector are then correlated in time with nuclear, atomic or electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these secondary electrons in the fit place.

  3. Integrated Dynamic Electron Solutions, Inc. | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Integrated Dynamic Electron Solutions, Inc. America's Next Top Energy Innovator Challenge 333 likes Integrated Dynamic Electron Solutions, Inc. Lawrence Livermore National Laboratory Dynamic Transmission Electron Microscopes DTEM reveal unprecedented details of the mechanisms underlying a host of nanoscale systems that are at the core of our current and future energy economy. A vast and growing number of materials utilized in the energy sector rely on nanostructured materials and their unique

  4. The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions

    SciTech Connect (OSTI)

    Cooper, David; Twitchett-Harrison, Alison C.; Midgley, Paul A.; Dunin-Borkowski, Rafal E.

    2007-05-01

    Electron beam irradiation is shown to significantly influence phase images recorded from focused ion beam milled GaAs p-n junction specimens examined using off-axis electron holography in the transmission electron microscope. Our results show that the use of improved electrical connections to the specimen overcomes this problem, and may allow the correct built in potential across the junction to be recovered.

  5. Consumer Electronics

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    & Events Expand News & Events Skip navigation links Residential Residential Lighting Energy Star Appliances Consumer Electronics Heat Pump Water Heaters Electric Storage Water...

  6. Near-Field Magneto-Optical Microscope (Patent) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Publication: United States Language: English Subject: 47 OTHER INSTRUMENTATION; FIBER OPTICS; MAGNETIC FIELDS; MICROSCOPES; POLARIZATION; RESOLUTION; DESIGN; OPERATION Word Cloud...

  7. Manipulation of subsurface carbon nanoparticles in Bi?Sr?CaCu?O8+? using a scanning tunneling microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Stollenwerk, A. J.; Gu, G.; Hurley, N.; Beck, B.; Spurgeon, K.; Kidd, T. E.

    2015-03-01

    We present evidence that subsurface carbon nanoparticles in Bi?Sr?CaCu?O8+? can be manipulated with nanometer precision using a scanning tunneling microscope. High resolution images indicate that most of the carbon particles remain subsurface after transport observable as a local increase in height as the particle pushes up on the surface. Tunneling spectra in the vicinity of these protrusions exhibit semiconducting characteristics with a band gap of approximately 1.8 eV, indicating that the incorporation of carbon locally alters the electronic properties near the surface.

  8. Microscopic analysis of order parameters in nuclear quantum phase transitions

    SciTech Connect (OSTI)

    Li, Z. P.; Niksic, T.; Vretenar, D.; Meng, J.

    2009-12-15

    Microscopic signatures of nuclear ground-state shape phase transitions in Nd isotopes are studied using excitation spectra and collective wave functions obtained by diagonalization of a five-dimensional Hamiltonian for quadrupole vibrational and rotational degrees of freedom, with parameters determined by constrained self-consistent relativistic mean-field calculations for triaxial shapes. As a function of the physical control parameter, the number of nucleons, energy gaps between the ground state and the excited vibrational states with zero angular momentum, isomer shifts, and monopole transition strengths exhibit sharp discontinuities at neutron number N=90, which is characteristic of a first-order quantum phase transition.

  9. Propagation of nonlinearly generated harmonic spin waves in microscopic stripes

    SciTech Connect (OSTI)

    Rousseau, O.; Yamada, M.; Miura, K.; Ogawa, S.; Otani, Y.

    2014-02-07

    We report on the experimental study of the propagation of nonlinearly generated harmonic spin waves in microscopic CoFeB stripes. Using an all electrical technique with coplanar waveguides, we find that two kinds of spin waves can be generated by nonlinear frequency multiplication. One has a non-uniform spatial geometry and thus requires appropriate detector geometry to be identified. The other corresponds to the resonant fundamental propagative spin waves and can be efficiently excited by double- or triple-frequency harmonics with any geometry. Nonlinear excited spin waves are particularly efficient in providing an electrical signal arising from spin wave propagation.

  10. Nature's Microscopic Masonry: Sucking in toxins, spitting out products

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Nature's Microscopic Masonry: Sucking in toxins, spitting out products Click to share on Facebook (Opens in new window) Click to share on Twitter (Opens in new window) Click to share on Reddit (Opens in new window) Click to share on Pinterest (Opens in new window) Scientists have for the first time viewed how bacterial proteins self-assemble into thin sheets and begin to form the walls of the outer shell for nano-sized polyhedral compartments that function as specialized factories. This research

  11. High Temperature Materials Laboratory Fourteenth Annual Report: October 2000 through September 2001

    SciTech Connect (OSTI)

    Pasto, A.E.

    2002-05-16

    The HTML User Program continued to work with industrial, academic, and governmental users this year, accepting 92 new projects and developing 48 new user agreements. Table 1 presents the breakdown of these statistics. Figure 1 depicts the continued growth in user agreements and user projects. You will note that the total number of HTML proposals has now exceeded 1000. Also, the large number of new agreements bodes well for the future. At the end of the report, we present a list of proposals to the HTML and a list of agreements between HTML and universities and industries, broken down by state. Program highlights this year included several outstanding user projects (some of which are highlighted in later sections), the annual meeting of the HTML Programs Senior Advisory Committee, and approval by ORNL for the construction of a building to house our new aberration-corrected electron microscope (ACEM) and several other sensitive electron and optical instruments.

  12. Microscopy with slow electrons: from LEEM to XPEEM

    ScienceCinema (OSTI)

    Bauer, Ernst [Arizona State University, Phoenix, Arizona, United States

    2010-01-08

    The short penetration and escape depth of electrons with energies below 1 keV make them ideally suited for the study of surfaces and ultrathin films. The combination of the low energy electrons and the high lateral resolution of a microscope produces a powerful method for the characterization of nanostructures on bulk samples, in particular if the microscope is equipped with an imaging energy filter and connected to a synchrotron radiation source. Comprehensive characterization by imaging, diffraction, and spectroscope of the structural, chemical, and magnetic properties is then possible. The Talk will describe the various imaging techniques in using reflected and emitted electrons in low-energy electron microscopy (LEEM) and x-ray photoemission electron microscopy (XPEEM), with an emphasis on magnetic materials with spin-polarized LEEM and x-ray magnetic circular dichroism PEEM. The talk with end with an outlook on future possibilities.

  13. Microscopic Evaluation of Contaminants in Ultra-High Purity Copper...

    Office of Scientific and Technical Information (OSTI)

    methods including scanning electron microscopy (SEM), laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), and secondary ionization mass spectrometry (SIMS). ...

  14. Identification of Fragile Microscopic Structures during Mineral Transformations in Wet Supercritical CO2

    SciTech Connect (OSTI)

    Arey, Bruce W.; Kovarik, Libor; Qafoku, Odeta; Wang, Zheming; Hess, Nancy J.; Felmy, Andrew R.

    2013-04-01

    In this study we examine the nature of highly fragile reaction products that form in low water content super critical carbon dioxide (scCO2) using a combination of scanning electron microscopy/focus ion beam (SEM/FIB), confocal Raman spectroscopy, helium ion microscopy (HeIM), and transmission electron microscopy (TEM). HeIM images show these precipitates to be fragile rosettes that can readily decompose even under slight heating from an electron beam. Using the TEM revealed details on the interfacial structure between the newly formed surface precipitates and the underlying initial solid phases. The detailed microscopic analysis revealed that the growth of the precipitates either followed a tip growth mechanism with precipitates forming directly on the forsterite surface if the initial solid was non-porous (natural forsterite) or growth from the surface of the precipitates where fluid was conducted through the porous (nanoforsterite) agglomerates to the growth center. The mechanism of formation of the hydrated/hydroxylated magnesium carbonate compound (HHMC) phases offers insight into the possible mechanisms of carbonate mineral formation from scCO2 solutions which has recently received a great deal of attention as the result of the potential for CO2 to act as an atmospheric greenhouse gas and impact overall global warming. The techniques used here to examine these fragile structures an also be used to examine a wide range of fragile material surfaces. SEM and FIB technologies have now been brought together in a single instrument, which represents a powerful combination for the studies in biological, geological and materials science.

  15. Carbon p electron ferromagnetism in silicon carbide

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Wang, Yutian; Liu, Yu; Wang, Gang; Anwand, Wolfgang; Jenkins, Catherine A.; Arenholz, Elke; Munnik, Frans; Gordan, Ovidiu D.; Salvan, Georgeta; Zahn, Dietrich R. T.; et al

    2015-03-11

    Ferromagnetism can occur in wide-band gap semiconductors as well as in carbon-based materials when specific defects are introduced. It is thus desirable to establish a direct relation between the defects and the resulting ferromagnetism. Here, we contribute to revealing the origin of defect-induced ferromagnetism using SiC as a prototypical example. We show that the long-range ferromagnetic coupling can be attributed to the p electrons of the nearest-neighbor carbon atoms around the VSiVC divacancies. Thus, the ferromagnetism is traced down to its microscopic electronic origin.

  16. Carbon p electron ferromagnetism in silicon carbide

    SciTech Connect (OSTI)

    Wang, Yutian; Liu, Yu; Wang, Gang; Anwand, Wolfgang; Jenkins, Catherine A.; Arenholz, Elke; Munnik, Frans; Gordan, Ovidiu D.; Salvan, Georgeta; Zahn, Dietrich R. T.; Chen, Xiaolong; Gemming, Sibylle; Helm, Manfred; Zhou, Shengqiang

    2015-03-11

    Ferromagnetism can occur in wide-band gap semiconductors as well as in carbon-based materials when specific defects are introduced. It is thus desirable to establish a direct relation between the defects and the resulting ferromagnetism. Here, we contribute to revealing the origin of defect-induced ferromagnetism using SiC as a prototypical example. We show that the long-range ferromagnetic coupling can be attributed to the p electrons of the nearest-neighbor carbon atoms around the VSiVC divacancies. Thus, the ferromagnetism is traced down to its microscopic electronic origin.

  17. Scanning optical microscope with long working distance objective

    DOE Patents [OSTI]

    Cloutier, Sylvain G.

    2010-10-19

    A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.

  18. A Microscopic Quantal Model for Nuclear Collective Rotation

    SciTech Connect (OSTI)

    Gulshani, P.

    2007-10-26

    A microscopic, quantal model to describe nuclear collective rotation in two dimensions is derived from the many-nucleon Schrodinger equation. The Schrodinger equation is transformed to a body-fixed frame to decompose the Hamiltonian into a sum of intrinsic and rotational components plus a Coriolis-centrifugal coupling term. This Hamiltonian (H) is expressed in terms of space-fixed-frame particle coordinates and momenta by using commutator of H with a rotation angle. A unified-rotational-model type wavefunction is used to obtain an intrinsic Schrodinger equation in terms of angular momentum quantum number and two-body operators. A Hartree-Fock mean-field representation of this equation is then obtained and, by means of a unitary transformation, is reduced to a form resembling that of the conventional semi-classical cranking model when exchange terms and intrinsic spurious collective excitation are ignored.

  19. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2013-01-22

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  20. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2009-06-23

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  1. Electron tube

    DOE Patents [OSTI]

    Suyama, Motohiro; Fukasawa, Atsuhito; Arisaka, Katsushi; Wang, Hanguo

    2011-12-20

    An electron tube of the present invention includes: a vacuum vessel including a face plate portion made of synthetic silica and having a surface on which a photoelectric surface is provided, a stem portion arranged facing the photoelectric surface and made of synthetic silica, and a side tube portion having one end connected to the face plate portion and the other end connected to the stem portion and made of synthetic silica; a projection portion arranged in the vacuum vessel, extending from the stem portion toward the photoelectric surface, and made of synthetic silica; and an electron detector arranged on the projection portion, for detecting electrons from the photoelectric surface, and made of silicon.

  2. Electronic Coupling Dependence of Ultrafast Interfacial Electron...

    Office of Scientific and Technical Information (OSTI)

    Electronic Coupling Dependence of Ultrafast Interfacial Electron Transfer on Nanocrystalline Thin Films and Single Crystal Citation Details In-Document Search Title: Electronic ...

  3. Electronic system

    DOE Patents [OSTI]

    Robison, G H; Dickson, J F

    1960-11-15

    An electronic system is designed for indicating the occurrence of a plurality of electrically detectable events within predetermined time intervals. The system comprises separate input means electrically associated with the events under observation an electronic channel associated with each input means, including control means and indicating means; timing means adapted to apply a signal from the input means after a predetermined time to the control means to deactivate each of the channels; and means for resetting the system to its initial condition after the observation of each group of events. (D.L.C.)

  4. ELECTRONIC SYSTEM

    DOE Patents [OSTI]

    Robison, G.H. et al.

    1960-11-15

    An electronic system is described for indicating the occurrence of a plurality of electrically detectable events within predetermined time intervals. It is comprised of separate input means electrically associated with the events under observation: an electronic channel associated with each input means including control means and indicating means; timing means associated with each of the input means and the control means and adapted to derive a signal from the input means and apply it after a predetermined time to the control means to effect deactivation of each of the channels; and means for resetting the system to its initial condition after observation of each group of events.

  5. Understanding glass-forming ability through sluggish crystallization of atomically thin metallic glassy films

    SciTech Connect (OSTI)

    Sun, Y. T.; Cao, C. R.; Huang, K. Q.; Zhao, N. J.; Gu, L. E-mail: dzheng@iphy.ac.cn Zheng, D. N. E-mail: dzheng@iphy.ac.cn Wang, W. H. E-mail: dzheng@iphy.ac.cn

    2014-08-04

    The glass-forming ability (GFA) of an alloy, closely related to its ability to resist crystallization, is a crucial issue in condensed matter physics. So far, the studies on GFA are mostly statistical and empirical guides. Benefiting from the ultrahigh thermal stability of ultrathin metallic glassy film and high resolution spherical aberration-corrected transmission electron microscope, the crystallization of atomically thin ZrCu and its microalloyed ZrCuAl glasses with markedly different GFA was investigated at the atomic scale. We find the Zr diffusivity estimated from the density of nuclei is dramatically decreased by adding of Al, which is the major reason for the much better GFA of the ZrCuAl metallic glass.

  6. Nonlocal microscopic theory of quantum friction between parallel metallic slabs

    SciTech Connect (OSTI)

    Despoja, Vito

    2011-05-15

    We present a new derivation of the friction force between two metallic slabs moving with constant relative parallel velocity, based on T=0 quantum-field theory formalism. By including a fully nonlocal description of dynamically screened electron fluctuations in the slab, and avoiding the usual matching-condition procedure, we generalize previous expressions for the friction force, to which our results reduce in the local limit. Analyzing the friction force calculated in the two local models and in the nonlocal theory, we show that for physically relevant velocities local theories using the plasmon and Drude models of dielectric response are inappropriate to describe friction, which is due to excitation of low-energy electron-hole pairs, which are properly included in nonlocal theory. We also show that inclusion of dissipation in the nonlocal electronic response has negligible influence on friction.

  7. THE NONLINEAR AND NONLOCAL LINK BETWEEN MACROSCOPIC ALFVNIC AND MICROSCOPIC ELECTROSTATIC SCALES IN THE SOLAR WIND

    SciTech Connect (OSTI)

    Valentini, F.; Vecchio, A.; Donato, S.; Carbone, V.; Veltri, P.; Briand, C.; Bougeret, J.

    2014-06-10

    The local heating of the solar-wind gas during its expansion represents one of the most intriguing problems in space plasma physics and is at present the subject of a relevant scientific effort. The possible mechanisms that could account for local heat production in the interplanetary medium are most likely related to the turbulent character of the solar-wind plasma. Nowadays, many observational and numerical analyses are devoted to the identification of fluctuation channels along which energy is carried from large to short wavelengths during the development of the turbulent cascade; these fluctuation channels establish the link between macroscopic and microscopic scales. In this Letter, by means of a quantitative comparison between in situ measurements in the solar wind from the STEREO spacecraft and numerical results from kinetic simulations, we identify an electrostatic channel of fluctuations that develops along the turbulent cascade in a direction parallel to the ambient magnetic field. This channel appears to be efficient in transferring the energy from large Alfvnic to short electrostatic acoustic-like scales up to a range of wavelengths where it can finally be turned into heat, even when the electron to proton temperature ratio is of the order of unity.

  8. Nonlocal microscopic theory of Casimir forces at finite temperature

    SciTech Connect (OSTI)

    Despoja, V.; Marusic, L.

    2011-04-15

    The interaction energy between two metallic slabs in the retarded limit at finite temperature is expressed in terms of surface polariton propagators for separate slabs, avoiding the usual matching procedure, with both diamagnetic and paramagnetic excitations included correctly. This enables appropriate treatment of arbitrary electron density profiles and fully nonlocal electronic response, including both collective and single-particle excitations. The results are verified by performing the nonretarded and long-wavelength (local) limits and showing that they reduce to the previously obtained expressions. Possibilities for practical use of the theory are explored by applying it to calculation of various contributions to the Casimir energy between two silver slabs.

  9. A new ion sensing deep atomic force microscope

    SciTech Connect (OSTI)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  10. Microscopic studies of nonlocal spin dynamics and spin transport (invited)

    SciTech Connect (OSTI)

    Adur, Rohan; Du, Chunhui; Cardellino, Jeremy; Scozzaro, Nicolas; Wolfe, Christopher S.; Wang, Hailong; Herman, Michael; Bhallamudi, Vidya P.; Pelekhov, Denis V.; Yang, Fengyuan; Hammel, P. Chris

    2015-05-07

    Understanding the behavior of spins coupling across interfaces in the study of spin current generation and transport is a fundamental challenge that is important for spintronics applications. The transfer of spin angular momentum from a ferromagnet into an adjacent normal material as a consequence of the precession of the magnetization of the ferromagnet is a process known as spin pumping. We find that, in certain circumstances, the insertion of an intervening normal metal can enhance spin pumping between an excited ferromagnetic magnetization and a normal metal layer as a consequence of improved spin conductance matching. We have studied this using inverse spin Hall effect and enhanced damping measurements. Scanned probe magnetic resonance techniques are a complementary tool in this context offering high resolution magnetic resonance imaging, localized spin excitation, and direct measurement of spin lifetimes or damping. Localized magnetic resonance studies of size-dependent spin dynamics in the absence of lithographic confinement in both ferromagnets and paramagnets reveal the close relationship between spin transport and spin lifetime at microscopic length scales. Finally, detection of ferromagnetic resonance of a ferromagnetic film using the photoluminescence of nitrogen vacancy spins in neighboring nanodiamonds demonstrates long-range spin transport between insulating materials, indicating the complexity and generality of spin transport in diverse, spatially separated, material systems.