National Library of Energy BETA

Sample records for aberration-corrected electron microscope

  1. Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution

    SciTech Connect (OSTI)

    Akashi, Tetsuya; Takahashi, Yoshio; Tanigaki, Toshiaki Shimakura, Tomokazu; Kawasaki, Takeshi; Furutsu, Tadao; Shinada, Hiroyuki; Osakabe, Nobuyuki; Mller, Heiko; Haider, Maximilian; Tonomura, Akira

    2015-02-16

    Atomic-resolution electromagnetic field observation is critical to the development of advanced materials and to the unveiling of their fundamental physics. For this purpose, a spherical-aberration corrected 1.2-MV cold field-emission transmission electron microscope has been developed. The microscope has the following superior properties: stabilized accelerating voltage, minimized electrical and mechanical fluctuation, and coherent electron emission. These properties have enabled to obtain 43-pm information transfer. On the bases of these performances, a 43-pm resolution has been obtained by correcting lens aberrations up to the third order. Observations of GaN [411] thin crystal showed a projected atomic locations with a separation of 44?pm.

  2. In situ observation on hydrogenation of Mg-Ni films using environmental transmission electron microscope with aberration correction

    SciTech Connect (OSTI)

    Matsuda, Junko; Yoshida, Kenta; Sasaki, Yukichi; Uchiyama, Naoki; Akiba, Etsuo

    2014-08-25

    In situ transmission electron microscopy (TEM) was performed to observe the hydrogenation of Mg-Ni films in a hydrogen atmosphere of 80100?Pa. An aberration-corrected environmental TEM with a differential pumping system allows us to reveal the Angstrom-scale structure of the films in the initial stage of hydrogenation: first, nucleation and growth of Mg{sub 2}NiH{sub 4} crystals with a lattice spacing of 0.22?nm in an Mg-rich amorphous matrix of the film occurs within 20 s after the start of the high-resolution observation, then crystallization of MgH{sub 2} with a smaller spacing of 0.15?nm happens after approximately 1?min. Our in situ TEM method is also applicable to the analysis of other hydrogen-related materials.

  3. In-situ Study of Dynamic Phenomena at Metal Nanosolder Interfaces Using Aberration Corrected Scanning Transmission Electron Microcopy.

    SciTech Connect (OSTI)

    Lu, Ping

    2014-10-01

    Controlling metallic nanoparticle (NP) interactions plays a vital role in the development of new joining techniques (nanosolder) that bond at lower processing temperatures but remain viable at higher temperatures. The pr imary objective of this project is t o develop a fundamental understanding of the actual reaction processes, associated atomic mechanisms, and the resulting microstructure that occur during thermally - driven bond formation concerning metal - metal nano - scale (<50nm) interfaces. In this LDRD pr oject, we have studied metallic NPs interaction at the elevated temperatures by combining in - situ transmission electron microscopy (TEM ) using an aberration - corrected scanning transmission electron microscope (AC - STEM) and atomic - scale modeling such as m olecular dynamic (MD) simulations. Various metallic NPs such as Ag, Cu and Au are synthesized by chemical routines. Numerous in - situ e xperiments were carried out with focus of the research on study of Ag - Cu system. For the first time, using in - situ STEM he ating experiments , we directly observed t he formation of a 3 - dimensional (3 - D) epitaxial Cu - Ag core - shell nanoparticle during the thermal interaction of Cu and Ag NPs at elevated temperatures (150 - 300 o C). The reaction takes place at temperatures as low as 150 o C and was only observed when care was taken to circumvent the effects of electron beam irradiation during STEM imaging. Atomic - scale modeling verified that the Cu - Ag core - shell structure is energetically favored, and indicated that this phenomenon is a nano - scale effect related to the large surface - to - volume ratio of the NPs. The observation potentially can be used for developing new nanosolder technology that uses Ag shell as the %22glue%22 that stic ks the particles of Cu together. The LDRD has led to several journal publications and numerous conference presentations, and a TA. In addition, we have developed new TEM characterization techniques and phase

  4. Device and method for creating Gaussian aberration-corrected electron beams

    DOE Patents [OSTI]

    McMorran, Benjamin; Linck, Martin

    2016-01-19

    Electron beam phase gratings have phase profiles that produce a diffracted beam having a Gaussian or other selected intensity profile. Phase profiles can also be selected to correct or compensate electron lens aberrations. Typically, a low diffraction order produces a suitable phase profile, and other orders are discarded.

  5. Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging

    SciTech Connect (OSTI)

    Schulz, T.; Remmele, T.; Korytov, M.; Markurt, T.; Albrecht, M.; Duff, A.; Lymperakis, L.; Neugebauer, J.; Chèze, C.

    2014-01-21

    Based on the evaluation of lattice parameter maps in aberration corrected high resolution transmission electron microscopy images, we propose a simple method that allows quantifying the composition and disorder of a semiconductor alloy at the unit cell scale with high accuracy. This is realized by considering, next to the out-of-plane, also the in-plane lattice parameter component allowing to separate the chemical composition from the strain field. Considering only the out-of-plane lattice parameter component not only yields large deviations from the true local alloy content but also carries the risk of identifying false ordering phenomena like formations of chains or platelets. Our method is demonstrated on image simulations of relaxed supercells, as well as on experimental images of an In{sub 0.20}Ga{sub 0.80}N quantum well. Principally, our approach is applicable to all epitaxially strained compounds in the form of quantum wells, free standing islands, quantum dots, or wires.

  6. Evaluation of stacking faults and associated partial dislocations in AlSb/GaAs (001) interface by aberration-corrected high-resolution transmission electron microscopy

    SciTech Connect (OSTI)

    Wen, C.; Ge, B. H.; Cui, Y. X.; Li, F. H.; Zhu, J.; Yu, R.; Cheng, Z. Y.

    2014-11-15

    The stacking faults (SFs) in an AlSb/GaAs (001) interface were investigated using a 300 kV spherical aberration-corrected high-resolution transmission electron microscope (HRTEM). The structure and strain distribution of the single and intersecting (V-shaped) SFs associated with partial dislocations (PDs) were characterized by the [110] HRTEM images and geometric phase analysis, respectively. In the biaxial strain maps ?{sub xx} and ?{sub yy}, a SF can be divided into several sections under different strain states (positive or negative strain values). Furthermore, the strain state for the same section of a SF is in contrast to each other in ?{sub xx} and ?{sub yy} strain maps. The modification in the strain states was attributed to the variation in the local atomic displacements for the SF in the AlSb film on the GaAs substrate recorded in the lattice image. Finally, the single SF was found to be bounded by two 30 PDs. A pair of 30 PDs near the heteroepitaxial interface reacted to form a Lomer-Cottrell sessile dislocation located at the vertices of V-shaped SFs with opposite screw components. The roles of misfit dislocations, such as the PDs, in strain relaxation were also discussed.

  7. Direct imaging of crystal structure and defects in metastable Ge{sub 2}Sb{sub 2}Te{sub 5} by quantitative aberration-corrected scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Ross, Ulrich; Lotnyk, Andriy Thelander, Erik; Rauschenbach, Bernd

    2014-03-24

    Knowledge about the atomic structure and vacancy distribution in phase change materials is of foremost importance in order to understand the underlying mechanism of fast reversible phase transformation. In this Letter, by combining state-of-the-art aberration-corrected scanning transmission electron microscopy with image simulations, we are able to map the local atomic structure and composition of a textured metastable Ge{sub 2}Sb{sub 2}Te{sub 5} thin film deposited by pulsed laser deposition with excellent spatial resolution. The atomic-resolution scanning transmission electron microscopy investigations display the heterogeneous defect structure of the Ge{sub 2}Sb{sub 2}Te{sub 5} phase. The obtained results are discussed. Highly oriented Ge{sub 2}Sb{sub 2}Te{sub 5} thin films appear to be a promising approach for further atomic-resolution investigations of the phase change behavior of this material class.

  8. Electron Microscope Facility

    ScienceCinema (OSTI)

    None

    2010-01-08

    Brookhaven Lab is home to one of only a few Scanning Transmision Electron Microscope (STEM) machines in the world and one of the few that can image single heavy atoms.

  9. Observation of Materials Processes in Liquids in the Electron Microscope

    SciTech Connect (OSTI)

    Wang, Chong M.; Liao, Honggang; Ross, Frances M.

    2015-01-01

    Materials synthesis and the functioning of devices often indispensably involve liquid media. But direct visualization of dynamic process in liquids, especially with high spatial and temporal resolution, has been challenging. For solid materials, advances in aberration corrected electron microscopy have made observation of atomic level features a routine practice. Here we discuss the extent to which one can take advantage of the resolution of modern electron microscopes to image phenomenon occuring in liquids. We will describe the fundamentals of two different experimental approaches, closed and open liquid cells. We will illustrate the capabilities of each approach by considering processes in batteries and nucleation and growth of nanoparticles from solution. We conclude that liquid cell electron microscopy appears to be duly fulfilling its role for in situ studies of nanoscale processes in liquids, revealing physical and chemical processes otherwise difficult to observe.

  10. Electron microscope phase enhancement

    DOE Patents [OSTI]

    Jin, Jian; Glaeser, Robert M.

    2010-06-15

    A microfabricated electron phase shift element is used for modifying the phase characteristics of an electron beam passing though its center aperture, while not affecting the more divergent portion of an incident beam to selectively provide a ninety-degree phase shift to the unscattered beam in the back focal plan of the objective lens, in order to realize Zernike-type, in-focus phase contrast in an electron microscope. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells. Preliminary experimental images demonstrate that these devices do apply a ninety degree phase shift as expected. Electrostatic calculations have been used to determine that fringing fields in the region of the scattered electron beams will cause a negligible phase shift as long as the ratio of electrode length to the transverse feature-size aperture is about 5:1. Calculations are underway to determine the feasibility of aspect smaller aspect ratios of about 3:1 and about 2:1.

  11. Transmission electron microscope CCD camera

    DOE Patents [OSTI]

    Downing, Kenneth H.

    1999-01-01

    In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.

  12. Nanomaterials Analysis using a Scanning Electron Microscope ...

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Nanomaterials Analysis using a Scanning Electron Microscope Technology available for licensing: Steradian X-ray detection system increases the detection capability of SEMs during...

  13. Ponderomotive phase plate for transmission electron microscopes...

    Office of Scientific and Technical Information (OSTI)

    A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high ...

  14. Aberration-corrected Czerny-Turner imaging spectrometer with a wide spectral region

    SciTech Connect (OSTI)

    Xue Qingsheng; Wang Shurong; Lu Fengqin

    2009-01-01

    A modified asymmetrical Czerny-Turner arrangement with a fixed plane grating is proposed to correct aberrations over a wide spectral region by analysis of the dependence of aberration correction for different wavelengths. The principle and method of aberration correction are described in detail. We compare the performance of this modified Czerny-Turner arrangement with that of the existing Czerny-Turner arrangement by using a practical Czerny-Turner imaging spectrometer example.

  15. Ponderomotive phase plate for transmission electron microscopes

    DOE Patents [OSTI]

    Reed, Bryan W. (Livermore, CA)

    2012-07-10

    A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.

  16. Electron Microscopy > Analytical Resources > Research > The Energy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Materials Center at Cornell Analytical Resources In This Section Differential Electrochemical Mass Spectroscopy (DEMS) Electron Microscopy X-Ray Diffraction Electron Microscopy Aberration-Corrected Electron Microscope Facility Electron microscopy provides atomic-resolution images of the structure, composition and bonding of our fuel cells and their components. Three-dimensional images of catalyst particles and their support materials are constructed using electron tomography - a similar

  17. Simultaneous specimen and stage cleaning device for analytical electron microscope

    DOE Patents [OSTI]

    Zaluzec, Nestor J.

    1996-01-01

    An improved method and apparatus are provided for cleaning both a specimen stage, a specimen and an interior of an analytical electron microscope (AEM). The apparatus for cleaning a specimen stage and specimen comprising a plasma chamber for containing a gas plasma and an air lock coupled to the plasma chamber for permitting passage of the specimen stage and specimen into the plasma chamber and maintaining an airtight chamber. The specimen stage and specimen are subjected to a reactive plasma gas that is either DC or RF excited. The apparatus can be mounted on the analytical electron microscope (AEM) for cleaning the interior of the microscope.

  18. Influence of mechanical noise inside a scanning electron microscope

    SciTech Connect (OSTI)

    Gaudenzi de Faria, Marcelo; Haddab, Yassine Le Gorrec, Yann; Lutz, Philippe

    2015-04-15

    The scanning electron microscope is becoming a popular tool to perform tasks that require positioning, manipulation, characterization, and assembly of micro-components. However, some of these applications require a higher level of performance with respect to dynamics and precision of positioning. One limiting factor is the presence of unidentified noises and disturbances. This work aims to study the influence of mechanical disturbances generated by the environment and by the microscope, identifying how these can affect elements in the vacuum chamber. To achieve this objective, a dedicated setup, including a high-resolution vibrometer, was built inside the microscope. This work led to the identification and quantification of main disturbances and noise sources acting on a scanning electron microscope. Furthermore, the effects of external acoustic excitations were analysed. Potential applications of these results include noise compensation and real-time control for high accuracy tasks.

  19. Chromatic-aberration-corrected diffractive lenses for ultra-broadband focusing

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Wang, Peng; Mohammad, Nabil; Menon, Rajesh

    2016-02-12

    We exploit the inherent dispersion in diffractive optics to demonstrate planar chromatic-aberration-corrected lenses. Specifically, we designed, fabricated and characterized cylindrical diffractive lenses that efficiently focus the entire visible band (450 nm to 700 nm) onto a single line. These devices are essentially pixelated, multi-level microstructures. Experiments confirm an average optical efficiency of 25% for a three-wavelength apochromatic lens whose chromatic focus shift is only 1.3 μm and 25 μm in the lateral and axial directions, respectively. Super-achromatic performance over the continuous visible band is also demonstrated with averaged lateral and axial focus shifts of only 1.65 μm and 73.6 μm,more » respectively. These lenses are easy to fabricate using single-step grayscale lithography and can be inexpensively replicated. Furthermore, these devices are thin (<3 μm), error tolerant, has low aspect ratio (<1:1) and offer polarization-insensitive focusing, all significant advantages compared to alternatives that rely on metasurfaces. Lastly, our design methodology offers high design flexibility in numerical aperture and focal length, and is readily extended to 2D.« less

  20. Measurement of Semiconductor Surface Potential using the Scanning Electron Microscope

    SciTech Connect (OSTI)

    Heath, J. T.; Jiang, C. S.; Al-Jassim, M. M.

    2012-02-15

    We calibrate the secondary electron signal from a standard scanning electron microscope to voltage, yielding an image of the surface or near-surface potential. Data on both atomically abrupt heterojunction GaInP/GaAs and diffused homojunction Si solar cell devices clearly show the expected variation in potential with position and applied bias, giving depletion widths and locating metallurgical junctions to an accuracy better than 10 nm. In some images, distortion near the p-n junction is observed, seemingly consistent with the effects of lateral electric fields (patch fields). Reducing the tube bias removes this distortion. This approach results in rapid and straightforward collection of near-surface potential data using a standard scanning electron microscope.

  1. Concurrent in situ ion irradiation transmission electron microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Hattar, K.; Bufford, D. C.; Buller, D. L.

    2014-08-29

    An in situ ion irradiation transmission electron microscope has been developed and is operational at Sandia National Laboratories. This facility permits high spatial resolution, real time observation of electron transparent samples under ion irradiation, implantation, mechanical loading, corrosive environments, and combinations thereof. This includes the simultaneous implantation of low-energy gas ions (0.8–30 keV) during high-energy heavy ion irradiation (0.8–48 MeV). In addition, initial results in polycrystalline gold foils are provided to demonstrate the range of capabilities.

  2. Circular dichroism in the electron microscope: Progress and applications (invited)

    SciTech Connect (OSTI)

    Schattschneider, P.; Loeffler, S.; Ennen, I.; Stoeger-Pollach, M.; Verbeeck, J.

    2010-05-15

    According to theory, x-ray magnetic circular dichroism in a synchrotron is equivalent to energy loss magnetic chiral dichroism (EMCD) in a transmission electron microscope (TEM). After a synopsis of the development of EMCD, the theoretical background is reviewed and recent results are presented, focusing on the study of magnetic nanoparticles for ferrofluids and Heusler alloys for spintronic devices. Simulated maps of the dichroic strength as a function of atom position in the crystal allow evaluating the influence of specimen thickness and sample tilt on the experimental EMCD signal. Finally, the possibility of direct observation of chiral electronic transitions with atomic resolution in a TEM is discussed.

  3. Photocathode Optimization for a Dynamic Transmission Electron Microscope: Final Report

    SciTech Connect (OSTI)

    Ellis, P; Flom, Z; Heinselman, K; Nguyen, T; Tung, S; Haskell, R; Reed, B W; LaGrange, T

    2011-08-04

    The Dynamic Transmission Electron Microscope (DTEM) team at Harvey Mudd College has been sponsored by LLNL to design and build a test setup for optimizing the performance of the DTEM's electron source. Unlike a traditional TEM, the DTEM achieves much faster exposure times by using photoemission from a photocathode to produce electrons for imaging. The DTEM team's work is motivated by the need to improve the coherence and current density of the electron cloud produced by the electron gun in order to increase the image resolution and contrast achievable by DTEM. The photoemission test setup is nearly complete and the team will soon complete baseline tests of electron gun performance. The photoemission laser and high voltage power supply have been repaired; the optics path for relaying the laser to the photocathode has been finalized, assembled, and aligned; the internal setup of the vacuum chamber has been finalized and mostly implemented; and system control, synchronization, and data acquisition has been implemented in LabVIEW. Immediate future work includes determining a consistent alignment procedure to place the laser waist on the photocathode, and taking baseline performance measurements of the tantalum photocathode. Future research will examine the performance of the electron gun as a function of the photoemission laser profile, the photocathode material, and the geometry and voltages of the accelerating and focusing components in the electron gun. This report presents the team's progress and outlines the work that remains.

  4. Miniature self-contained vacuum compatible electronic imaging microscope

    DOE Patents [OSTI]

    Naulleau, Patrick P.; Batson, Phillip J.; Denham, Paul E.; Jones, Michael S.

    2001-01-01

    A vacuum compatible CCD-based microscopic camera with an integrated illuminator. The camera can provide video or still feed from the microscope contained within a vacuum chamber. Activation of an optional integral illuminator can provide light to illuminate the microscope subject. The microscope camera comprises a housing with a objective port, modified objective, beam-splitter, CCD camera, and LED illuminator.

  5. Aberration-corrected X-ray spectrum imaging and Fresnel contrast to differentiate nanoclusters and cavities in helium-irradiated alloy 14YWT

    SciTech Connect (OSTI)

    Miller, Michael K; Parish, Chad M

    2014-01-01

    Helium accumulation negatively impacts structural materials used in neutron-irradiated environments, such as fission and fusion reactors. Next-generation fission and fusion reactors will require structural materials, such as steels, resistant to large neutron doses yet see service temperatures in the range most affected by helium embrittlement. Previous work has indicated the difficulty of experimentally differentiating nanometer-sized helium bubbles from the Ti-Y-O rich nanoclustsers (NCs) in radiation-tolerant nanostructured ferritic alloys (NFAs). Because the NCs are expected to sequester helium away from grain boundaries and reduce embrittlement, experimental methods to study simultaneously the NC and bubble populations are needed. In this study, aberration-corrected scanning transmission electron microscopy (STEM) results combining high-collection-efficiency X-ray spectrum images (SIs), multivariate statistical analysis (MVSA), and Fresnel-contrast bright-field STEM imaging have been used for such a purpose. Results indicate that Fresnel-contrast imaging, with careful attention to TEM-STEM reciprocity, differentiates bubbles from NCs, and MVSA of X-ray SIs unambiguously identifies NCs. Therefore, combined Fresnel-contrast STEM and X-ray SI is an effective STEM-based method to characterize helium-bearing NFAs.

  6. Migration of Single Iridium Atoms and Tri-iridium Clusters on MgO Surfaces. Aberration-Corrected STEM Imaging and ab-initio Calculations

    SciTech Connect (OSTI)

    Han, Chang W.; Iddir, Hakim; Uzun, Alper; Curtiss, Larry A.; Browning, Nigel D.; Gates, Bruce C.; Ortalan, Volkan

    2015-11-06

    To address the challenge of fast, direct atomic-scale visualization of the diffusion of atoms and clusters on surfaces, we used aberration-corrected scanning transmission electron microscopy (STEM) with high scan speeds (as little as ~0.1 s per frame) to visualize the diffusion of (1) a heavy atom (Ir) on the surface of a support consisting of light atoms, MgO(100), and (2) an Ir3 cluster on MgO(110). Sequential Z-contrast images elucidate the diffusion mechanisms, including the hopping of Ir1 and the rotational migration of Ir3 as two Ir atoms remain anchored to the surface. Density functional theory (DFT) calculations provided estimates of the diffusion energy barriers and binding energies of the iridium species to the surfaces. The results show how the combination of fast-scan STEM and DFT calculations allow real-time visualization and fundamental understanding of surface diffusion phenomena pertaining to supported catalysts and other materials.

  7. Transmission electron microscope sample holder with optical features

    DOE Patents [OSTI]

    Milas, Mirko; Zhu, Yimei; Rameau, Jonathan David

    2012-03-27

    A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.

  8. A novel low energy electron microscope for DNA sequencing and surface analysis

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Mankos, M.; Shadman, K.; Persson, H. H. J.; N’Diaye, A. T.; Schmid, A. K.; Davis, R. W.

    2014-01-31

    Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) is a novel technique that is directed towards imaging nanostructures and surfaces with sub-nanometer resolution. The technique combines a monochromator, a mirror aberration corrector, an energy filter, and dual beam illumination in a single instrument. The monochromator reduces the energy spread of the illuminating electron beam, which significantly improves spectroscopic and spatial resolution. Simulation results predict that the novel aberration corrector design will eliminate the second rank chromatic and third and fifth order spherical aberrations, thereby improving the resolution into the sub-nanometer regime at landing energies as low as one hundred electron-Volts.more » The energy filter produces a beam that can extract detailed information about the chemical composition and local electronic states of non-periodic objects such as nanoparticles, interfaces, defects, and macromolecules. The dual flood illumination eliminates charging effects that are generated when a conventional LEEM is used to image insulating specimens. A potential application for MAD-LEEM is in DNA sequencing, which requires high resolution to distinguish the individual bases and high speed to reduce the cost. The MAD-LEEM approach images the DNA with low electron impact energies, which provides nucleobase contrast mechanisms without organometallic labels. Furthermore, the micron-size field of view when combined with imaging on the fly provides long read lengths, thereby reducing the demand on assembling the sequence. Finally, experimental results from bulk specimens with immobilized single-base oligonucleotides demonstrate that base specific contrast is available with reflected, photo-emitted, and Auger electrons. Image contrast simulations of model rectangular features mimicking the individual nucleotides in a DNA strand have been developed to translate measurements of contrast on bulk DNA to the

  9. Electron Microscopy Center Capabilities | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Capabilities ACAT: Argonne Chromatic Aberration-corrected TEM This FEI Titan 80-300 ST has a CEOS Cc/Cs corrector on the imaging side of the column to correct both spherical and chromatic aberrations. The Cc/Cs corrector also provides greatly-improved resolution and signal for energy filtered imaging and EELS. FEI Tecnai F20ST TEM/STEM This premier analytical transmission electron microscope (AEM) has specialized accessories including an energy-dispersive x-ray

  10. High Cycle Fatigue in the Transmission Electron Microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Bufford, Daniel C.; Stauffer, Douglas; Mook, William M.; Syed Asif, S. A.; Boyce, Brad L.; Hattar, Khalid

    2016-06-28

    One of the most common causes of structural failure in metals is fatigue induced by cyclic loading. Historically, microstructure-level analysis of fatigue cracks has primarily been performed post mortem. However, such investigations do not directly reveal the internal structural processes at work near micro- and nanoscale fatigue cracks and thus do not provide direct evidence of active microstructural mechanisms. In this paper, the tension–tension fatigue behavior of nanocrystalline Cu was monitored in real time at the nanoscale by utilizing a new capability for quantitative cyclic mechanical loading performed in situ in a transmission electron microscope (TEM). Controllable loads were appliedmore » at frequencies from one to several hundred hertz, enabling accumulations of 106 cycles within 1 h. The nanometer-scale spatial resolution of the TEM allows quantitative fatigue crack growth studies at very slow crack growth rates, measured here at ~10–12 m·cycle–1. This represents an incipient threshold regime that is well below the tensile yield stress and near the minimum conditions for fatigue crack growth. Evidence of localized deformation and grain growth within 150 nm of the crack tip was observed by both standard imaging and precession electron diffraction orientation mapping. Finally, these observations begin to reveal with unprecedented detail the local microstructural processes that govern damage accumulation, crack nucleation, and crack propagation during fatigue loading in nanocrystalline Cu.« less

  11. Remote control of a scanning electron microscope aperture and gun alignment

    DOE Patents [OSTI]

    Cramer, Charles E.; Campchero, Robert J.

    2003-10-07

    This invention relates to a remote control system which through gear motors coupled to the scanning electron microscope (SEM) manual control knobs readily permits remote adjustments as necessary.

  12. Apparatus and methods for controlling electron microscope stages

    DOE Patents [OSTI]

    Duden, Thomas

    2015-08-11

    Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive control sphere based at least in part on the received crystal parameters and that is rotatable by a user to different sphere orientations is presented. The sphere includes a plurality of stage coordinates that correspond to a plurality of positions of the stage and a plurality of crystallographic pole coordinates that correspond to a plurality of polar orientations of the crystal sample. Movement of the sphere causes movement of the stage, wherein the stage coordinates move in conjunction with the crystallographic coordinates represented by pole positions so as to show a relationship between stage positions and the pole positions.

  13. An ultrafast electron microscope gun driven by two-photon photoemission from a nanotip cathode

    SciTech Connect (OSTI)

    Bormann, Reiner; Strauch, Stefanie; Schäfer, Sascha Ropers, Claus

    2015-11-07

    We experimentally and numerically investigate the performance of an advanced ultrafast electron source, based on two-photon photoemission from a tungsten needle cathode incorporated in an electron microscope gun geometry. Emission properties are characterized as a function of the electrostatic gun settings, and operating conditions leading to laser-triggered electron beams of very low emittance (below 20 nm mrad) are identified. The results highlight the excellent suitability of optically driven nano-cathodes for the further development of ultrafast transmission electron microscopy.

  14. Analysis with electron microscope of multielement samples using pure element standards

    DOE Patents [OSTI]

    King, W.E.

    1986-01-06

    This disclosure describes a method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons. Simultaneously the electron dosage and x-ray intensities are measured for each sample of element to determine a ''K/sub AB/'' value to be used in the equation (I/sub A/I/sub B/) = K/sub AB/ (C/sub A//C/sub B/), where I is intensity and C is concentration for elements A and B. The multielement sample is exposed to determine the concentrations of the elements in the sample.

  15. Analysis with electron microscope of multielement samples using pure element standards

    DOE Patents [OSTI]

    King, Wayne E.

    1987-01-01

    A method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons, simultaneously measuring the electron dosage and x-ray intensities for each sample of element to determine a "K.sub.AB " value to be used in the equation ##EQU1## where I is intensity and C is concentration for elements A and B, and exposing the multielement sample to determine the concentrations of the elements in the sample.

  16. Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope

    SciTech Connect (OSTI)

    de Jonge, Niels

    2010-08-17

    A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.

  17. The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory

    SciTech Connect (OSTI)

    Peterson, Randolph S.; Berggren, Karl K.; Mondol, Mark

    2011-06-01

    Few universities or colleges have an accelerator for use with advanced physics laboratories, but many of these institutions have a scanning electron microscope (SEM) on site, often in the biology department. As an accelerator for the undergraduate, advanced physics laboratory, the SEM is an excellent substitute for an ion accelerator. Although there are no nuclear physics experiments that can be performed with a typical 30 kV SEM, there is an opportunity for experimental work on accelerator physics, atomic physics, electron-solid interactions, and the basics of modern e-beam lithography.

  18. Concurrent in situ ion irradiation transmission electron microscope

    SciTech Connect (OSTI)

    Hattar, K.; Bufford, D. C.; Buller, D. L.

    2014-08-29

    An in situ ion irradiation transmission electron microscope has been developed and is operational at Sandia National Laboratories. This facility permits high spatial resolution, real time observation of electron transparent samples under ion irradiation, implantation, mechanical loading, corrosive environments, and combinations thereof. This includes the simultaneous implantation of low-energy gas ions (0.830 keV) during high-energy heavy ion irradiation (0.848 MeV). In addition, initial results in polycrystalline gold foils are provided to demonstrate the range of capabilities.

  19. Damage-free vibrational spectroscopy of biological materials in the electron microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Rez, Peter; Aoki, Toshihiro; March, Katia; Gur, Dvir; Krivanek, Ondrej L.; Dellby, Niklas; Lovejoy, Tracy C.; Wolf, Sharon G.; Cohen, Hagai

    2016-03-10

    Vibrational spectroscopy in the electron microscope would be transformative in the study of biological samples, provided that radiation damage could be prevented. However, electron beams typically create high-energy excitations that severely accelerate sample degradation. Here this major difficulty is overcome using an ‘aloof’ electron beam, positioned tens of nanometres away from the sample: high-energy excitations are suppressed, while vibrational modes of energies o1 eV can be ‘safely’ investigated. To demonstrate the potential of aloof spectroscopy, we record electron energy loss spectra from biogenic guanine crystals in their native state, resolving their characteristic C–H, N–H and C=O vibrational signatures with nomore » observable radiation damage. Furthermore, the technique opens up the possibility of non-damaging compositional analyses of organic functional groups, including non-crystalline biological materials, at a spatial resolution of ~10nm, simultaneously combined with imaging in the electron microscope.« less

  20. Achieving atomic resolution magnetic dichroism by controlling the phase symmetry of an electron probe

    SciTech Connect (OSTI)

    Rusz, Jan; Idrobo, Juan -Carlos; Bhowmick, Somnath

    2014-09-30

    The calculations presented here reveal that an electron probe carrying orbital angular momentum is just a particular case of a wider class of electron beams that can be used to measure electron magnetic circular dichroism (EMCD) with atomic resolution. It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning transmission electron microscope. The probe’s required phase distribution depends on the sample’s magnetic symmetry and crystal structure. The calculations indicate that EMCD signals that use the electron probe’s phase are as strong as those obtained by nanodiffraction methods.

  1. Achieving atomic resolution magnetic dichroism by controlling the phase symmetry of an electron probe

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Rusz, Jan; Idrobo, Juan -Carlos; Bhowmick, Somnath

    2014-09-30

    The calculations presented here reveal that an electron probe carrying orbital angular momentum is just a particular case of a wider class of electron beams that can be used to measure electron magnetic circular dichroism (EMCD) with atomic resolution. It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning transmission electron microscope. The probe’s required phase distribution depends on the sample’s magnetic symmetry and crystal structure. The calculations indicate that EMCD signals that use the electron probe’s phase are as strongmore » as those obtained by nanodiffraction methods.« less

  2. High-speed multi-frame dynamic transmission electron microscope image acquisition system with arbitrary timing

    DOE Patents [OSTI]

    Reed, Bryan W.; DeHope, William J.; Huete, Glenn; LaGrange, Thomas B.; Shuttlesworth, Richard M.

    2016-02-23

    An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses each being of a programmable pulse duration, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has a plurality of plates. A control system having a digital sequencer controls the laser and a plurality of switching components, synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to enable programmable pulse durations and programmable inter-pulse spacings.

  3. High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

    DOE Patents [OSTI]

    Reed, Bryan W.; DeHope, William J.; Huete, Glenn; LaGrange, Thomas B.; Shuttlesworth, Richard M.

    2015-10-20

    An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.

  4. Magnetic lens apparatus for a low-voltage high-resolution electron microscope

    DOE Patents [OSTI]

    Crewe, Albert V.

    1996-01-01

    A lens apparatus in which a beam of charged particles of low accelerating voltage is brought to a focus by a magnetic field, the lens being situated behind the target position. The lens comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. The lens apparatus comprises the sole focusing lens for high-resolution imaging in a low-voltage scanning electron microscope.

  5. Sensitivity Analysis of X-ray Spectra from Scanning Electron Microscopes

    SciTech Connect (OSTI)

    Miller, Thomas Martin; Patton, Bruce W.; Weber, Charles F.; Bekar, Kursat B.

    2014-10-01

    The primary goal of this project is to evaluate x-ray spectra generated within a scanning electron microscope (SEM) to determine elemental composition of small samples. This will be accomplished by performing Monte Carlo simulations of the electron and photon interactions in the sample and in the x-ray detector. The elemental inventories will be determined by an inverse process that progressively reduces the difference between the measured and simulated x-ray spectra by iteratively adjusting composition and geometric variables in the computational model. The intended benefit of this work will be to develop a method to perform quantitative analysis on substandard samples (heterogeneous phases, rough surfaces, small sizes, etc.) without involving standard elemental samples or empirical matrix corrections (i.e., true standardless quantitative analysis).

  6. Phase and birefringence aberration correction

    DOE Patents [OSTI]

    Bowers, M.; Hankla, A.

    1996-07-09

    A Brillouin enhanced four wave mixing phase conjugate mirror corrects phase aberrations of a coherent electromagnetic beam and birefringence induced upon that beam. The stimulated Brillouin scattering (SBS) phase conjugation technique is augmented to include Brillouin enhanced four wave mixing (BEFWM). A seed beam is generated by a main oscillator which arrives at the phase conjugate cell before the signal beams in order to initiate the Brillouin effect. The signal beam which is being amplified through the amplifier chain is split into two perpendicularly polarized beams. One of the two beams is chosen to be the same polarization as some component of the seed beam, the other orthogonal to the first. The polarization of the orthogonal beam is then rotated 90{degree} such that it is parallel to the other signal beam. The three beams are then focused into cell containing a medium capable of Brillouin excitation. The two signal beams are focused such that they cross the seed beam path before their respective beam waists in order to achieve BEFWM or the two signal beams are focused to a point or points contained within the focused cone angle of the seed beam to achieve seeded SBS, and thus negate the effects of all birefringent and material aberrations in the system. 5 figs.

  7. Phase and birefringence aberration correction

    DOE Patents [OSTI]

    Bowers, Mark; Hankla, Allen

    1996-01-01

    A Brillouin enhanced four wave mixing phase conjugate mirror corrects phase aberrations of a coherent electromagnetic beam and birefringence induced upon that beam. The stimulated Brillouin scattering (SBS) phase conjugation technique is augmented to include Brillouin enhanced four wave mixing (BEFWM). A seed beam is generated by a main oscillator which arrives at the phase conjugate cell before the signal beams in order to initiate the Brillouin effect. The signal beam which is being amplified through the amplifier chain is split into two perpendicularly polarized beams. One of the two beams is chosen to be the same polarization as some component of the seed beam, the other orthogonal to the first. The polarization of the orthogonal beam is then rotated 90.degree. such that it is parallel to the other signal beam. The three beams are then focused into cell containing a medium capable of Brillouin excitation. The two signal beams are focused such that they cross the seed beam path before their respective beam waists in order to achieve BEFWM or the two signal beams are focused to a point or points contained within the focused cone angle of the seed beam to achieve seeded SBS, and thus negate the effects of all birefringent and material aberrations in the system.

  8. High resolution transmission electron microscopic in-situ observations of plastic deformation of compressed nanocrystalline gold

    SciTech Connect (OSTI)

    Wang, Guoyong; Lian, Jianshe; Jiang, Qing; Sun, Sheng; Zhang, Tong-Yi

    2014-09-14

    Nanocrystalline (nc) metals possess extremely high strength, while their capability to deform plastically has been debated for decades. Low ductility has hitherto been considered an intrinsic behavior for most nc metals, due to the lack of five independent slip systems actively operating during deformation in each nanograin. Here we report in situ high resolution transmission electron microscopic (HRTEM) observations of deformation process of nc gold under compression, showing the excellent ductility of individual and aggregate nanograins. Compression causes permanent change in the profile of individual nanograins, which is mediated by dislocation slip and grain rotation. The high rate of grain boundary sliding and large extent of widely exited grain rotation may meet the boundary compatibility requirements during plastic deformation. The in situ HRTEM observations suggest that nc gold is not intrinsically brittle under compressive loading.

  9. 2013 R&D 100 Award: Movie-mode electron microscope captures nanoscale

    ScienceCinema (OSTI)

    Lagrange, Thomas; Reed, Bryan

    2014-07-21

    A new instrument developed by LLNL scientists and engineers, the Movie Mode Dynamic Transmission Electron Microscope (MM-DTEM), captures billionth-of-a-meter-scale images with frame rates more than 100,000 times faster than those of conventional techniques. The work was done in collaboration with a Pleasanton-based company, Integrated Dynamic Electron Solutions (IDES) Inc. Using this revolutionary imaging technique, a range of fundamental and technologically important material and biological processes can be captured in action, in complete billionth-of-a-meter detail, for the first time. The primary application of MM-DTEM is the direct observation of fast processes, including microstructural changes, phase transformations and chemical reactions, that shape real-world performance of nanostructured materials and potentially biological entities. The instrument could prove especially valuable in the direct observation of macromolecular interactions, such as protein-protein binding and host-pathogen interactions. While an earlier version of the technology, Single Shot-DTEM, could capture a single snapshot of a rapid process, MM-DTEM captures a multiframe movie that reveals complex sequences of events in detail. It is the only existing technology that can capture multiple electron microscopy images in the span of a single microsecond.

  10. Solving the Accelerator-Condenser Coupling Problem in a Nanosecond Dynamic Transmission Electron Microscope

    SciTech Connect (OSTI)

    Reed, B W; LaGrange, T; Shuttlesworth, R M; Gibson, D J; Campbell, G H; Browning, N D

    2009-12-29

    We describe a modification to a transmission electron microscope (TEM) that allows it to briefly (using a pulsed-laser-driven photocathode) operate at currents in excess of 10 mA while keeping the effects of condenser lens aberrations to a minimum. This modification allows real-space imaging of material microstructure with a resolution of order 10 nm over regions several {micro}m across with an exposure time of 15 ns. This is more than 6 orders of magnitude faster than typical video-rate TEM imaging. The key is the addition of a weak magnetic lens to couple the large-diameter high-current beam exiting the accelerator into the acceptance aperture of a conventional TEM condenser lens system. We show that the performance of the system is essentially consistent with models derived from ray tracing and finite element simulations. The instrument can also be operated as a conventional TEM by using the electron gun in a thermionic mode. The modification enables very high electron current densities in {micro}m-sized areas and could also be used in a non-pulsed system for high-throughput imaging and analytical TEM.

  11. Transmission electron microscopic study of pyrochlore to defect-fluorite transition in rare-earth pyrohafnates

    SciTech Connect (OSTI)

    Karthik, Chinnathambi; Center for Advanced Energy Studies, 995 University Blvd, Idaho Falls, ID 83415 ; Anderson, Thomas J.; Gout, Delphine; Ubic, Rick; Center for Advanced Energy Studies, 995 University Blvd, Idaho Falls, ID 83415

    2012-10-15

    A structural transition in rare earth pyrohafnates, Ln{sub 2}Hf{sub 2}O{sub 7} (Ln=Y, La, Pr, Nd, Tb, Dy, Yb and Lu), has been identified. Neutron diffraction showed that the structure transforms from well-ordered pyrochloric to fully fluoritic through the lanthanide series from La to Lu with a corresponding increase in the position parameter x of the 48f (Fd3{sup Macron }m) oxygen site from 0.330 to 0.375. As evidenced by the selected area electron diffraction, La{sub 2}Hf{sub 2}O{sub 7}, Pr{sub 2}Hf{sub 2}O{sub 7} and Nd{sub 2}Hf{sub 2}O{sub 7} exhibited a well-ordered pyrocholoric structure with the presence of intense superlattice spots, which became weak and diffuse (in Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}) before disappearing completely as the series progressed towards the Lu end. High resolution electron microscopic studies showed the breakdown of the pyrochlore ordering in the form of antiphase domains resulting in diffused smoke-like superlattice spots in the case of Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}. - Graphical abstract: Transmission electron microscopic studies showed the ordered pyrochlore to defect fluorite transition in rare-earth pyrohafnates to occur via the formation of anti-phase domains to start with. Highlights: Black-Right-Pointing-Pointer Pyrochlore to fluorite structural transition in rare earth pyrohafnates. Black-Right-Pointing-Pointer La{sub 2}Hf{sub 2}O{sub 7}, Pr{sub 2}Hf{sub 2}O{sub 7} and Nd{sub 2}Hf{sub 2}O{sub 7} showed well ordered pyrochlore structure. Black-Right-Pointing-Pointer Short range ordering in Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}. Black-Right-Pointing-Pointer Break down of pyrochlore ordering due to antiphase boundaries. Black-Right-Pointing-Pointer Rest of the series showed fluoritic structure.

  12. Novel scanning electron microscope bulge test technique integrated with loading function

    SciTech Connect (OSTI)

    Li, Chuanwei; Xie, Huimin E-mail: xiehm@mail.tsinghua.edu.cn; Liu, Zhanwei E-mail: xiehm@mail.tsinghua.edu.cn

    2014-10-15

    Membranes and film-on-substrate structures are critical elements for some devices in electronics industry and for Micro Electro Mechanical Systems devices. These structures are normally at the scale of micrometer or even nanometer. Thus, the measurement for the mechanical property of these membranes poses a challenge over the conventional measurements at macro-scales. In this study, a novel bulge test method is presented for the evaluation of mechanical property of micro thin membranes. Three aspects are discussed in the study: (a) A novel bulge test with a Scanning Electron Microscope system realizing the function of loading and measuring simultaneously; (b) a simplified Digital Image Correlation method for a height measurement; and (c) an imaging distortion correction by the introduction of a scanning Moir method. Combined with the above techniques, biaxial modulus as well as Young's modulus of the polyimide film can be determined. Besides, a standard tensile test is conducted as an auxiliary experiment to validate the feasibility of the proposed method.

  13. Sparse sampling and reconstruction for electron and scanning probe microscope imaging

    DOE Patents [OSTI]

    Anderson, Hyrum; Helms, Jovana; Wheeler, Jason W.; Larson, Kurt W.; Rohrer, Brandon R.

    2015-07-28

    Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.

  14. In-situ optical transmission electron microscope study of exciton phonon replicas in ZnO nanowires by cathodoluminescence

    SciTech Connect (OSTI)

    Yang, Shize; Tian, Xuezeng; Wang, Lifen; Wei, Jiake; Qi, Kuo; Li, Xiaomin; Xu, Zhi E-mail: xdbai@iphy.ac.cn Wang, Wenlong; Zhao, Jimin; Bai, Xuedong E-mail: xdbai@iphy.ac.cn; Wang, Enge E-mail: xdbai@iphy.ac.cn

    2014-08-18

    The cathodoluminescence spectrum of single zinc oxide (ZnO) nanowires is measured by in-situ optical Transmission Electron Microscope. The coupling between exciton and longitudinal optical phonon is studied. The band edge emission varies for different excitation spots. This effect is attributed to the exciton propagation along the c axis of the nanowire. Contrary to free exciton emission, the phonon replicas are well confined in ZnO nanowire. They travel along the c axis and emit at the end surface. Bending strain increases the relative intensity of second order phonon replicas when excitons travel along the c-axis.

  15. Magnetic lens apparatus for use in high-resolution scanning electron microscopes and lithographic processes

    DOE Patents [OSTI]

    Crewe, Albert V. (Dune Acres, IN)

    2000-01-01

    Disclosed are lens apparatus in which a beam of charged particlesis brought to a focus by means of a magnetic field, the lens being situated behind the target position. In illustrative embodiments, a lens apparatus is employed in a scanning electron microscopeas the sole lens for high-resolution focusing of an electron beam, and in particular, an electron beam having an accelerating voltage of from about 10 to about 30,000 V. In one embodiment, the lens apparatus comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. In other embodiments, the lens apparatus comprises a magnetic dipole or virtual magnetic monopole fabricated from a variety of materials, including permanent magnets, superconducting coils, and magnetizable spheres and needles contained within an energy-conducting coil. Multiple-array lens apparatus are also disclosed for simultaneous and/or consecutive imaging of multiple images on single or multiple specimens. The invention further provides apparatus, methods, and devices useful in focusing charged particle beams for lithographic processes.

  16. Real-time studies of battery electrochemical reactions inside a transmission electron microscope.

    SciTech Connect (OSTI)

    Leung, Kevin; Hudak, Nicholas S.; Liu, Yang; Liu, Xiaohua H.; Fan, Hongyou; Subramanian, Arunkumar; Shaw, Michael J.; Sullivan, John Patrick; Huang, Jian Yu

    2012-01-01

    We report the development of new experimental capabilities and ab initio modeling for real-time studies of Li-ion battery electrochemical reactions. We developed three capabilities for in-situ transmission electron microscopy (TEM) studies: a capability that uses a nanomanipulator inside the TEM to assemble electrochemical cells with ionic liquid or solid state electrolytes, a capability that uses on-chip assembly of battery components on to TEM-compatible multi-electrode arrays, and a capability that uses a TEM-compatible sealed electrochemical cell that we developed for performing in-situ TEM using volatile battery electrolytes. These capabilities were used to understand lithiation mechanisms in nanoscale battery materials, including SnO{sub 2}, Si, Ge, Al, ZnO, and MnO{sub 2}. The modeling approaches used ab initio molecular dynamics to understand early stages of ethylene carbonate reduction on lithiated-graphite and lithium surfaces and constrained density functional theory to understand ethylene carbonate reduction on passivated electrode surfaces.

  17. Transmission Electron Microscope In Situ Straining Technique to Directly Observe Defects and Interfaces During Deformation in Magnesium

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Morrow, Benjamin M.; Cerreta, E. K.; McCabe, R. J.; Tomé, C. N.

    2015-05-14

    In-situ straining was used to study deformation behavior of hexagonal close-packed (hcp) metals.Twinning and dislocation motion, both essential to plasticity in hcp materials, were observed.Typically, these processes are characterized post-mortem by examining remnant microstructural features after straining has occurred. By imposing deformation during imaging, direct observation of active deformation mechanisms is possible. This work focuses on straining of structural metals in a transmission electron microscope (TEM), and a recently developed technique that utilizes familiar procedures and equipment to increase ease of experiments. In-situ straining in a TEM presents several advantages over conventional post-mortem characterization, most notably time-resolution of deformation andmore » streamlined identification of active deformation mechanisms. Drawbacks to the technique and applicability to other studies are also addressed. In-situ straining is used to study twin boundary motion in hcp magnesium. A {101¯2} twin was observed during tensile and compressive loading. Twin-dislocation interactions are directly observed. Notably, dislocations are observed to remain mobile, even after multiple interactions with twin boundaries, a result which suggests that Basinki’s dislocation transformation mechanism by twinning is not present in hcp metals. The coupling of in-situ straining with traditional post-mortem characterization yields more detailed information about material behavior during deformation than either technique alone.« less

  18. Transmission Electron Microscope In Situ Straining Technique to Directly Observe Defects and Interfaces During Deformation in Magnesium

    SciTech Connect (OSTI)

    Morrow, Benjamin M.; Cerreta, E. K.; McCabe, R. J.; Tom, C. N.

    2015-05-14

    In-situ straining was used to study deformation behavior of hexagonal close-packed (hcp) metals.Twinning and dislocation motion, both essential to plasticity in hcp materials, were observed.Typically, these processes are characterized post-mortem by examining remnant microstructural features after straining has occurred. By imposing deformation during imaging, direct observation of active deformation mechanisms is possible. This work focuses on straining of structural metals in a transmission electron microscope (TEM), and a recently developed technique that utilizes familiar procedures and equipment to increase ease of experiments. In-situ straining in a TEM presents several advantages over conventional post-mortem characterization, most notably time-resolution of deformation and streamlined identification of active deformation mechanisms. Drawbacks to the technique and applicability to other studies are also addressed. In-situ straining is used to study twin boundary motion in hcp magnesium. A {1012} twin was observed during tensile and compressive loading. Twin-dislocation interactions are directly observed. Notably, dislocations are observed to remain mobile, even after multiple interactions with twin boundaries, a result which suggests that Basinkis dislocation transformation mechanism by twinning is not present in hcp metals. The coupling of in-situ straining with traditional post-mortem characterization yields more detailed information about material behavior during deformation than either technique alone.

  19. Transmission Electron Microscope In Situ Straining Technique to Directly Observe Defects and Interfaces During Deformation in Magnesium

    SciTech Connect (OSTI)

    Morrow, Benjamin M.; Cerreta, E. K.; McCabe, R. J.; Tomé, C. N.

    2015-05-14

    In-situ straining was used to study deformation behavior of hexagonal close-packed (hcp) metals.Twinning and dislocation motion, both essential to plasticity in hcp materials, were observed.Typically, these processes are characterized post-mortem by examining remnant microstructural features after straining has occurred. By imposing deformation during imaging, direct observation of active deformation mechanisms is possible. This work focuses on straining of structural metals in a transmission electron microscope (TEM), and a recently developed technique that utilizes familiar procedures and equipment to increase ease of experiments. In-situ straining in a TEM presents several advantages over conventional post-mortem characterization, most notably time-resolution of deformation and streamlined identification of active deformation mechanisms. Drawbacks to the technique and applicability to other studies are also addressed. In-situ straining is used to study twin boundary motion in hcp magnesium. A {101¯2} twin was observed during tensile and compressive loading. Twin-dislocation interactions are directly observed. Notably, dislocations are observed to remain mobile, even after multiple interactions with twin boundaries, a result which suggests that Basinki’s dislocation transformation mechanism by twinning is not present in hcp metals. The coupling of in-situ straining with traditional post-mortem characterization yields more detailed information about material behavior during deformation than either technique alone.

  20. Electron microscopic evaluation and fission product identification of irradiated TRISO coated particles from the AGR-1 experiment: A preliminary Study

    SciTech Connect (OSTI)

    I J van Rooyen; D E Janney; B D Miller; J L Riesterer; P A Demkowicz

    2012-10-01

    ABSTRACT Post-irradiation examination of coated particle fuel from the AGR-1 experiment is in progress at Idaho National Laboratory and Oak Ridge National Laboratory. In this presentation a brief summary of results from characterization of microstructures in the coating layers of selected irradiated fuel particles with burnup of 11.3% and 19.3% FIMA will be given. The main objective of the characterization were to study irradiation effects, fuel kernel porosity, layer debonding, layer degradation or corrosion, fission-product precipitation, grain sizes, and transport of fission products from the kernels across the TRISO layers. Characterization techniques such as scanning electron microscopy, transmission electron microscopy, energy dispersive spectroscopy, and wavelength dispersive spectroscopy were used. A new approach to microscopic quantification of fission-product precipitates is also briefly demonstrated. The characterization emphasized fission-product precipitates in the SiC-IPyC interface, SiC layer and the fuel-buffer interlayer, and provided significant new insights into mechanisms of fission-product transport. Although Pd-rich precipitates were identified at the SiC-IPyC interlayer, no significant SiC-layer thinning was observed for the particles investigated. Characterization of these precipitates highlighted the difficulty of measuring low concentration Ag in precipitates with significantly higher concentrations of contain Pd and U. Different approaches to resolving this problem are discussed. Possible microstructural differences between particles with high and low releases of Ag particles are also briefly discussed, and an initial hypothesis is provided to explain fission-product precipitate compositions and locations. No SiC phase transformations or debonding of the SiC-IPyC interlayer as a result of irradiation were observed. Lessons learned from the post-irradiation examination are described and future actions are recommended.

  1. Fine precipitation scenarios of AlZnMg(Cu) alloys revealed by advanced atomic-resolution electron microscopy study Part I: Structure determination of the precipitates in AlZnMg(Cu) alloys

    SciTech Connect (OSTI)

    Liu, J.Z.; Chen, J.H.; Yuan, D.W.; Wu, C.L.; Zhu, J.; Cheng, Z.Y.

    2015-01-15

    Although they are among the most important precipitation-hardened materials for industry applications, the high-strength AlZnMg(Cu) alloys have thus far not yet been understood adequately about their underlying precipitation scenarios in relation with the properties. This is partly due to the fact that the structures of a number of different precipitates involved in electron microscopy in association with quantitative image simulations have to be employed; a systematic study of these hardening precipitates in different alloys is also necessary. In Part I of the present study, it is shown that there are five types of structurally different precipitates including the equilibrium η-phase precipitate. Using two state-of-the-art atomic-resolution imaging techniques in electron microscopy in association with quantitative image simulations, we have determined and clarified all the unknown precipitate structures. It is demonstrated that atomic-resolution imaging can directly suggest approximate structure models, whereas quantitative image analysis can refine the structure details that are much smaller than the resolution of the microscope. This combination is crucially important for solving the difficult structure problems of the strengthening precipitates in AlZnMg(Cu) alloys. - Highlights: Part I: • We determine and verify all the key precipitate structures in AlMgZn(Cu) alloys. • We employ aberration-corrected scanning transmission electron microscopy (STEM). • We use aberration-corrected high-resolution TEM (HRTEM) for the investigations. • We obtain atomic-resolution images of the precipitates and model their structures. • We refine all precipitate structures with quantitative image simulation analysis. Part II: • The hardening precipitates in AlZnMg alloys shall be classified into two groups. • Two precipitation scenarios coexist in the alloys. • The precipitation behavior of such an alloy depends on the alloy's composition. • Very detailed phase

  2. Fabrication of large area plasmonic nanoparticle grating structure on silver halide based transmission electron microscope film and its application as a surface enhanced Raman spectroscopy substrate

    SciTech Connect (OSTI)

    Sudheer, Tiwari, P.; Singh, M. N.; Sinha, A. K.; Rai, V. N.; Srivastava, A. K.; Bhartiya, S.; Mukherjee, C.

    2015-08-14

    The plasmonic responses of silver nanoparticle grating structures of different periods made on silver halide based electron microscope film are investigated. Raster scan of the conventional scanning electron microscope (SEM) is used to carry out electron beam lithography for fabricating the plasmonic nanoparticle grating (PNG) structures. Morphological characterization of the PNG structures, carried out by the SEM and the atomic force microscope, indicates that the depth of the groove decreases with a decrease in the grating period. Elemental characterization performed by the energy dispersive spectroscopy and the x-ray diffraction shows the presence of nanoparticles of silver in the PNG grating. The optical characterization of the gratings shows that the localized surface plasmon resonance peak shifts from 366 to 378 nm and broadens with a decrease in grating period from 10 to 2.5 μm. The surface enhanced Raman spectroscopy of the Rhodamine-6G dye coated PNG structure shows the maximum enhancement by two orders of magnitude in comparison to the randomly distributed silver nanoparticles having similar size and shape as the PNG structure.

  3. Fish scale deformation analysis using scanning electron microscope: New potential biomarker in aquatic environmental monitoring of aluminum and iron contamination

    SciTech Connect (OSTI)

    Hidayati, Dewi; Sulaiman, Norela; Othman, Shuhaimi; Ismail, B. S.

    2013-11-27

    Fish scale has the potential to be a rapid biomarker due to its structure and high possibility to come into contact with any pollutant in the aquatic environment. The scale structure consists of osteoblastic cells and other bone materials such as collagen where it is possible to form a molecular complex with heavy metals such as aluminum and iron. Hence, aluminum and iron in water could possibly destroy the scale material and marked as a scale deformation that quantitatively could be analyzed by comparing it to the normal scale structure. Water sampling and fish cage experiment were performed between June and July 2011 in Porong river which represented the water body that has high aluminum and iron contamination. The filtered water samples were preserved and extracted using the acid-mixture procedure prior to measurement of the aluminum and iron concentrations using Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES), while samples for total suspended solid (TSS) analysis were kept at 4 °C in cool-boxes. The scales were cleaned with sterile water, then dehydrated in 30, 50, 70, and 90% ethanol and dried on filter papers. They were then mounted on an aluminum stub and coated with gold in a sputter coater prior to Scanning Electron Microscope (SEM) observation. According to the SEM analysis, it was found that there were several deformations on the scale samples taken from sites that have high concentrations of aluminum and iron i.e. the increasing number of pits, deformation and decreasing number of spherules and ridges while the control scale exhibited the normal features. However, the site with higher TSS and pH indicated lower aluminum effect. A moderate correlation was found between the number of pits with aluminum (r=0.43) and iron (r=0.41) concentrations. Fish scale deformation using SEM analysis can potentially be a rapid biomarker in aquatic monitoring of aluminum and iron contamination. However, the measurement must be accompanied by pH and

  4. Femtosecond photoelectron point projection microscope

    SciTech Connect (OSTI)

    Quinonez, Erik; Handali, Jonathan; Barwick, Brett

    2013-10-15

    By utilizing a nanometer ultrafast electron source in a point projection microscope we demonstrate that images of nanoparticles with spatial resolutions of the order of 100 nanometers can be obtained. The duration of the emission process of the photoemitted electrons used to make images is shown to be of the order of 100 fs using an autocorrelation technique. The compact geometry of this photoelectron point projection microscope does not preclude its use as a simple ultrafast electron microscope, and we use simple analytic models to estimate temporal resolutions that can be expected when using it as a pump-probe ultrafast electron microscope. These models show a significant increase in temporal resolution when comparing to ultrafast electron microscopes based on conventional designs. We also model the microscopes spectroscopic abilities to capture ultrafast phenomena such as the photon induced near field effect.

  5. Nano-scale luminescence characterization of individual InGaN/GaN quantum wells stacked in a microcavity using scanning transmission electron microscope cathodoluminescence

    SciTech Connect (OSTI)

    Schmidt, Gordon Mller, Marcus; Veit, Peter; Bertram, Frank; Christen, Jrgen; Glauser, Marlene; Carlin, Jean-Franois; Cosendey, Gatien; Butt, Raphal; Grandjean, Nicolas

    2014-07-21

    Using cathodoluminescence spectroscopy directly performed in a scanning transmission electron microscope at liquid helium temperatures, the optical and structural properties of a 62 InGaN/GaN multiple quantum well embedded in an AlInN/GaN based microcavity are investigated at the nanometer scale. We are able to spatially resolve a spectral redshift between the individual quantum wells towards the surface. Cathodoluminescence spectral linescans allow directly visualizing the critical layer thickness in the quantum well stack resulting in the onset of plastic relaxation of the strained InGaN/GaN system.

  6. A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization

    SciTech Connect (OSTI)

    Berger, Andrew J. Page, Michael R.; Young, Justin R.; Bhallamudi, Vidya P.; Johnston-Halperin, Ezekiel; Pelekhov, Denis V.; Hammel, P. Chris; Jacob, Jan; Lewis, Jim; Wenzel, Lothar

    2014-12-15

    Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

  7. Future of Electron Scattering and Diffraction

    SciTech Connect (OSTI)

    Hall, Ernest; Stemmer, Susanne; Zheng, Haimei; Zhu, Yimei; Maracas, George

    2014-02-25

    spectroscopy with high spatial resolution without damaging their structure. The strong interaction of electrons with matter allows high-energy electron pulses to gather structural information before a sample is damaged. Electron ScatteringImaging, diffraction, and spectroscopy are the fundamental capabilities of electron-scattering instruments. The DOE BES-funded TEAM (Transmission Electron Aberration-corrected Microscope) project achieved unprecedented sub-atomic spatial resolution in imaging through aberration-corrected transmission electron microscopy. To further advance electron scattering techniques that directly enable groundbreaking science, instrumentation must advance beyond traditional two-dimensional imaging. Advances in temporal resolution, recording the full phase and energy spaces, and improved spatial resolution constitute a new frontier in electron microscopy, and will directly address the BES Grand Challenges, such as to “control the emergent properties that arise from the complex correlations of atomic and electronic constituents” and the “hidden states” “very far away from equilibrium”. Ultrafast methods, such as the pump-probe approach, enable pathways toward understanding, and ultimately controlling, the chemical dynamics of molecular systems and the evolution of complexity in mesoscale and nanoscale systems. Central to understanding how to synthesize and exploit functional materials is having the ability to apply external stimuli (such as heat, light, a reactive flux, and an electrical bias) and to observe the resulting dynamic process in situ and in operando, and under the appropriate environment (e.g., not limited to UHV conditions). To enable revolutionary advances in electron scattering and science, the participants of the workshop recommended three major new instrumental developments: A. Atomic-Resolution Multi-Dimensional Transmission Electron Microscope: This instrument would provide quantitative information over the entire real space

  8. Total energy study of the microscopic structure and electronic properties of tetragonal perovskite SrTiO{sub 3}

    SciTech Connect (OSTI)

    Rubio-Ponce, A.; Olgun, D.

    2014-05-15

    To study the structural and electronic properties of cubic perovskite SrTiO{sub 3} and its stress-induced tetragonal phase, we have performed total energy calculations and studied the effect of oxygen vacancies on the electronic properties of tetragonal perovskite SrTiO{sub 3}. The method used was the relativistic full-potential linearized augmented plane wave (FLAPW) method. To obtain the geometry that minimizes the total energy, we relaxed the internal atomic sites of the tetragonal cell. As a result of this procedure, we have found that the titanium atoms move toward the plane of the vacancy by 0.03 , and the apical oxygen atoms move to the same plane by approximately 0.14 . These results are discussed in comparison with experimental data.

  9. Quantum oscillations in a two-dimensional electron gas at the rocksalt/zincblende interface of PbTe/CdTe (111) heterostructures

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhang, Bingpo; Lu, Ping; Liu, Henan; Jiao, Lin; Ye, Zhenyu; Jaime, M.; Balakirev, F. F.; Yuan, Huiqiu; Wu, Huizhen; Pan, Wei; et al

    2015-06-05

    Quantum oscillations are observed in the 2DEG system at the interface of novel heterostructures, PbTe/CdTe (111), with nearly identical lattice parameters (aPbTe = 0.6462 nm, aCdTe = 0.648 nm) but very different lattice structures (PbTe: rock salt, CdTe: zinc blende). The 2DEG formation mechanism, a mismatch in the bonding configurations of the valence electrons at the interface, is uniquely different from the other known 2DEG systems. The aberration-corrected scanning transmission electron microscope (AC-STEM) characterization indicates an abrupt interface without cation interdiffusion due to a large miscibility gap between the two constituent materials. As a result, electronic transport measurements under magneticmore » field up to 60 T, with the observation of Landau level filling factor ν = 1, unambiguously reveal a π Berry phase, suggesting the Dirac Fermion nature of the 2DEG at the heterostructure interface, and the PbTe/CdTe heterostructure being a new candidate for 2D topological crystalline insulators.« less

  10. Quantum oscillations in a two-dimensional electron gas at the rocksalt/zincblende interface of PbTe/CdTe (111) heterostructures.

    SciTech Connect (OSTI)

    Zhang, Bingpo; Lu, Ping; Liu, Henan; Jiao, Lin; Ye, Zhenyu; Jaime, M.; Balakirev, F. F.; Yuan, Huiqiu; Wu, Huizhen; Pan, Wei; Zhang, Yong

    2015-06-05

    Quantum oscillations are observed in the 2DEG system at the interface of novel heterostructures, PbTe/CdTe (111), with nearly identical lattice parameters (aPbTe = 0.6462 nm, aCdTe = 0.648 nm) but very different lattice structures (PbTe: rock salt, CdTe: zinc blende). The 2DEG formation mechanism, a mismatch in the bonding configurations of the valence electrons at the interface, is uniquely different from the other known 2DEG systems. The aberration-corrected scanning transmission electron microscope (AC-STEM) characterization indicates an abrupt interface without cation interdiffusion due to a large miscibility gap between the two constituent materials. As a result, electronic transport measurements under magnetic field up to 60 T, with the observation of Landau level filling factor ν = 1, unambiguously reveal a π Berry phase, suggesting the Dirac Fermion nature of the 2DEG at the heterostructure interface, and the PbTe/CdTe heterostructure being a new candidate for 2D topological crystalline insulators.

  11. Quantum oscillations in a two-dimensional electron gas at the rocksalt/zincblende interface of PbTe/CdTe (111) heterostructures

    SciTech Connect (OSTI)

    Zhang, Bingpo; Lu, Ping; Liu, Henan; Jiao, Lin; Ye, Zhenyu; Jaime, M.; Balakirev, F. F.; Yuan, Huiqiu; Wu, Huizhen; Pan, Wei; Zhang, Yong

    2015-06-05

    Quantum oscillations are observed in the 2DEG system at the interface of novel heterostructures, PbTe/CdTe (111), with nearly identical lattice parameters (aPbTe = 0.6462 nm, aCdTe = 0.648 nm) but very different lattice structures (PbTe: rock salt, CdTe: zinc blende). The 2DEG formation mechanism, a mismatch in the bonding configurations of the valence electrons at the interface, is uniquely different from the other known 2DEG systems. The aberration-corrected scanning transmission electron microscope (AC-STEM) characterization indicates an abrupt interface without cation interdiffusion due to a large miscibility gap between the two constituent materials. As a result, electronic transport measurements under magnetic field up to 60 T, with the observation of Landau level filling factor ν = 1, unambiguously reveal a π Berry phase, suggesting the Dirac Fermion nature of the 2DEG at the heterostructure interface, and the PbTe/CdTe heterostructure being a new candidate for 2D topological crystalline insulators.

  12. Laboratory-size three-dimensional x-ray microscope with Wolter type I mirror optics and an electron-impact water window x-ray source

    SciTech Connect (OSTI)

    Ohsuka, Shinji; Ohba, Akira; Onoda, Shinobu; Nakamoto, Katsuhiro; Nakano, Tomoyasu; Miyoshi, Motosuke; Soda, Keita; Hamakubo, Takao

    2014-09-15

    We constructed a laboratory-size three-dimensional water window x-ray microscope that combines wide-field transmission x-ray microscopy with tomographic reconstruction techniques, and observed bio-medical samples to evaluate its applicability to life science research fields. It consists of a condenser and an objective grazing incidence Wolter type I mirror, an electron-impact type oxygen Kα x-ray source, and a back-illuminated CCD for x-ray imaging. A spatial resolution limit of around 1.0 line pairs per micrometer was obtained for two-dimensional transmission images, and 1-μm scale three-dimensional fine structures were resolved.

  13. Crystallographic analysis of the solid-state dewetting of polycrystalline gold film using automated indexing in a transmission electron microscope

    SciTech Connect (OSTI)

    Jang, S. A.; Lee, H. J.; Oh, Y. J.; Thompson, C. V.; Ross, C. A.

    2015-12-01

    We analyzed the effect of crystallographic anisotropy on the morphological evolution of a 12-nm-thick gold film during solid-state dewetting at high temperatures using automated indexing tool in a transmission electron microscopy. Dewetting initiated at grain-boundary triple junctions adjacent to large grains resulting from abnormal grain growth driven by (111) texture development. Voids at the junctions developed shapes with faceted edges bounded by low-index crystal planes. The kinetic mobility of the edges varied with the crystal orientation normal to the edges, with a predominance of specific edges with the slowest retraction rates as the annealing time was increased.

  14. X-ray diffraction and electron microscope studies of yttria stabilized zirconia (YSZ) ceramic coatings exposed to vanadia. Master's thesis

    SciTech Connect (OSTI)

    Kondos, K.G.

    1992-09-01

    The U.S. Navy sometimes has the requirement to use low cost fuels containing significant amounts of vanadium and sulfur in gas turbine engines. Unfortunately the yttria stabilized zirconia (YSZ) witch is used as a thermal barrier coating on gas turbine blades can be severely attacked by vanadia. Powders of YSZ containing 8-mol% Y203 and pure zirconia containing various and mounts Of V205 were annealed at 900 deg. C. These were then examined by X-ray diffraction and electron microscopy, as well as single crystals of pure Zro2 and YSZ ( 20% Wt Y203 ) exposed to V205 Melts, to study how the vanadia degrades the YSZ by reacting with the stabilizer to form YVO4 and how the vanadium transforms the cubic and tetragonal YSZ crystal structures to monoclinic which degrades rapidly as a gas turbine blade coating.

  15. The use of the scanning electron microscope in the determination of the mineral composition of Ballachulish slate

    SciTech Connect (OSTI)

    Walsh, Joan A.

    2007-11-15

    Slate is a fine-grained, low-grade metamorphic rock derived from argillaceous sediments or occasionally volcanic ash. Although most slates contain mainly quartz, chlorite and white mica, they vary considerably in their durability, some lasting centuries while others fail after a few years of service. A detailed characterisation of their mineralogy is required for the assessment of performance, and to establish the provenance of a used slate. A combination of methods was used to examine Ballachulish slates; XRD analysis to determine the principal minerals present, XRF analysis to determine the total chemical composition, and scanning electron microscopy to determine the chemical composition of individual minerals. It was found that the white mica in Ballachulish slate is phengite and the chlorite is ripidolite. Feldspar is present as albite and carbonate as ferroan dolomite. Several accessory minerals were also identified, including chloritoid, monzonite and zircon. There was considerable variation in the ratio of the principal minerals, making it impossible to identify used slates by this criterion. Instead, chemical composition of the individual minerals, and possibly key accessory minerals, should be used to determine the provenance of slates.

  16. Low-loss electron energy loss spectroscopy: An atomic-resolution complement to optical spectroscopies and application to graphene

    SciTech Connect (OSTI)

    Kapetanakis, Myron; Zhou, Wu; Oxley, Mark P.; Lee, Jaekwang; Prange, Micah P.; Pennycook, Stephen J.; Idrobo Tapia, Juan Carlos; Pantelides, Sokrates T.

    2015-09-25

    Photon-based spectroscopies have played a central role in exploring the electronic properties of crystalline solids and thin films. They are a powerful tool for probing the electronic properties of nanostructures, but they are limited by lack of spatial resolution. On the other hand, electron-based spectroscopies, e.g., electron energy loss spectroscopy (EELS), are now capable of subangstrom spatial resolution. Core-loss EELS, a spatially resolved analog of x-ray absorption, has been used extensively in the study of inhomogeneous complex systems. In this paper, we demonstrate that low-loss EELS in an aberration-corrected scanning transmission electron microscope, which probes low-energy excitations, combined with a theoretical framework for simulating and analyzing the spectra, is a powerful tool to probe low-energy electron excitations with atomic-scale resolution. The theoretical component of the method combines density functional theory–based calculations of the excitations with dynamical scattering theory for the electron beam. We apply the method to monolayer graphene in order to demonstrate that atomic-scale contrast is inherent in low-loss EELS even in a perfectly periodic structure. The method is a complement to optical spectroscopy as it probes transitions entailing momentum transfer. The theoretical analysis identifies the spatial and orbital origins of excitations, holding the promise of ultimately becoming a powerful probe of the structure and electronic properties of individual point and extended defects in both crystals and inhomogeneous complex nanostructures. The method can be extended to probe magnetic and vibrational properties with atomic resolution.

  17. Low-loss electron energy loss spectroscopy: An atomic-resolution complement to optical spectroscopies and application to graphene

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Kapetanakis, Myron; Zhou, Wu; Oxley, Mark P.; Lee, Jaekwang; Prange, Micah P.; Pennycook, Stephen J.; Idrobo Tapia, Juan Carlos; Pantelides, Sokrates T.

    2015-09-25

    Photon-based spectroscopies have played a central role in exploring the electronic properties of crystalline solids and thin films. They are a powerful tool for probing the electronic properties of nanostructures, but they are limited by lack of spatial resolution. On the other hand, electron-based spectroscopies, e.g., electron energy loss spectroscopy (EELS), are now capable of subangstrom spatial resolution. Core-loss EELS, a spatially resolved analog of x-ray absorption, has been used extensively in the study of inhomogeneous complex systems. In this paper, we demonstrate that low-loss EELS in an aberration-corrected scanning transmission electron microscope, which probes low-energy excitations, combined with amore » theoretical framework for simulating and analyzing the spectra, is a powerful tool to probe low-energy electron excitations with atomic-scale resolution. The theoretical component of the method combines density functional theory–based calculations of the excitations with dynamical scattering theory for the electron beam. We apply the method to monolayer graphene in order to demonstrate that atomic-scale contrast is inherent in low-loss EELS even in a perfectly periodic structure. The method is a complement to optical spectroscopy as it probes transitions entailing momentum transfer. The theoretical analysis identifies the spatial and orbital origins of excitations, holding the promise of ultimately becoming a powerful probe of the structure and electronic properties of individual point and extended defects in both crystals and inhomogeneous complex nanostructures. The method can be extended to probe magnetic and vibrational properties with atomic resolution.« less

  18. News Item

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    4, 2016 Time: 11:00 am Speaker: Ondrej Krivanek, Nion Title: Atomic-Resolution and Vibrational Studies of Materials by Aberration-Corrected Scanning Transmission Electron Microscopy Location: 67-3111 Chemla Room Abstract: Aberration-corrected scanning transmission electron microscopes (AC-STEMs) are able to form electron probes as small as 0.5 Å in diameter, and they can image and spectroscopically analyze single atoms in-situ. NCEM and Nion have pioneered many of these advances. Nion's main

  19. Quantitative in-situ scanning electron microscope pull-out experiments and molecular dynamics simulations of carbon nanotubes embedded in palladium

    SciTech Connect (OSTI)

    Hartmann, S., E-mail: steffen.hartmann@etit.tu-chemnitz.de; Blaudeck, T.; Hermann, S.; Wunderle, B. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Hlck, O. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Fraunhofer IZM Berlin, Gustav-Meyer-Allee 25, 13355 Berlin (Germany); Schulz, S. E.; Gessner, T. [Technische Universitt Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Fraunhofer ENAS Chemnitz, Technologie-Campus 3, 09126 Chemnitz (Germany)

    2014-04-14

    In this paper, we present our results of experimental and numerical pull-out tests on carbon nanotubes (CNTs) embedded in palladium. We prepared simple specimens by employing standard silicon wafers, physical vapor deposition of palladium and deposition of CNTs with a simple drop coating technique. An AFM cantilever with known stiffness connected to a nanomanipulation system was utilized inside a scanning electron microscope (SEM) as a force sensor to determine forces acting on a CNT during the pull-out process. SEM-images of the cantilever attached to a CNT have been evaluated for subsequent displacement steps with greyscale correlation to determine the cantilever deflection. We compare the experimentally obtained pull-out forces with values of numerical investigations by means of molecular dynamics and give interpretations for deviations according to material impurities or defects and their influence on the pull-out data. We find a very good agreement of force data from simulation and experiment, which is 17 nN and in the range of 1061 nN, respectively. Our findings contribute to the ongoing research of the mechanical characterization of CNT-metal interfaces. This is of significant interest for the design of future mechanical sensors utilizing the intrinsic piezoresistive effect of CNTs or other future devices incorporating CNT-metal interfaces.

  20. Microscope and method of use

    DOE Patents [OSTI]

    Bongianni, Wayne L.

    1984-01-01

    A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers.

  1. Microscope and method of use

    DOE Patents [OSTI]

    Bongianni, W.L.

    1984-04-17

    A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers. 7 figs.

  2. Solid state optical microscope

    DOE Patents [OSTI]

    Young, Ian T.

    1983-01-01

    A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

  3. Solid state optical microscope

    DOE Patents [OSTI]

    Young, I.T.

    1983-08-09

    A solid state optical microscope wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. A galvanometer scanning mirror, for scanning in one of two orthogonal directions is provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal. 2 figs.

  4. Direct observation of the structural and electronic changes of Li{sub 2}MnO{sub 3} during electron irradiation

    SciTech Connect (OSTI)

    Phillips, Patrick J.; Klie, Robert F. [Department of Physics, University of Illinois at Chicago, Chicago, Illinois 60607 (United States); Iddir, Hakim [Materials Science Division, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, Illinois 60439 (United States); Abraham, Daniel P. [Argonne National Laboratory, Chemical Sciences and Engineering, 9700 S. Cass Avenue, Argonne, Illinois 60439 (United States)

    2014-09-15

    This study focuses on the effects of electron beam induced irradiation to the layered oxide Li{sub 2}MnO{sub 3}. Aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy are used to characterize structural and electronic transitions in the material during irradiation, with a focus on changes in Mn valence and O content. This truly in situ irradiation allows for specific particle tracking, dose quantification, and real-time observation, while demonstrating many parallels to the oxide's structure evolution observed during electrochemical cycling. Furthermore, it is demonstrated that typical imaging conditions are not severe enough to induce damage to the pristine oxide.

  5. Chromatic-aberration-corrected diffractive lenses for ultra-broadband...

    Office of Scientific and Technical Information (OSTI)

    Additional Journal Information: Journal Volume: 6; Journal ID: ISSN 2045-2322 Publisher: Nature Publishing Group Research Org: Univ. of Utah, Salt Lake City, UT (United States) ...

  6. Chromatic-aberration-corrected diffractive lenses for ultra-broadband...

    Office of Scientific and Technical Information (OSTI)

    ... Utah, Salt Lake City, UT 84112, USA. Correspondence and requests for materials should be ... J. A. & Menon, R. Design and analysis of multi-wavelength diffractive optics. ...

  7. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2010-07-13

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  8. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2009-11-10

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of impaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  9. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2007-12-11

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  10. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2010-06-29

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  11. Spin microscope based on optically detected magnetic resonance

    DOE Patents [OSTI]

    Berman, Gennady P.; Chernobrod, Boris M.

    2009-10-27

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  12. Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy

    SciTech Connect (OSTI)

    Kovacs, Andras; Ney, A.; Duchamp, Martial; Ney, V.; Boothroyd, Chris; Galindo, Pedro L.; Kaspar, Tiffany C.; Chambers, Scott A.; Dunin-Borkowski, Rafal

    2013-12-23

    We have studied planar defects in epitaxial Co:ZnO dilute magnetic semiconductor thin films deposited on c-plane sapphire (Al2O3) and the Co:ZnO/Al2O3 interface structure at atomic resolution using aberration-corrected transmission electron microscopy (TEM) and electron energy-loss spectroscopy (EELS). Comparing Co:ZnO samples deposited by pulsed laser deposition and reactive magnetron sputtering, both exhibit extrinsic stacking faults, incoherent interface structures, and compositional variations within the first 3-4 Co:ZnO layers at the interface.. In addition, we have measured the local strain which reveals the lattice distortion around the stacking faults.

  13. Nikon PTIPHOT-88 Optical Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    OPTIPHOT-88 Optical Microscope micro1.jpg (69171 bytes)

  14. Cryogenic immersion microscope

    DOE Patents [OSTI]

    Le Gros, Mark; Larabell, Carolyn A.

    2010-12-14

    A cryogenic immersion microscope whose objective lens is at least partially in contact with a liquid reservoir of a cryogenic liquid, in which reservoir a sample of interest is immersed is disclosed. When the cryogenic liquid has an index of refraction that reduces refraction at interfaces between the lens and the sample, overall resolution and image quality are improved. A combination of an immersion microscope and x-ray microscope, suitable for imaging at cryogenic temperatures is also disclosed.

  15. Frontiers of in situ electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by inmore » this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.« less

  16. A method for measuring the local gas pressure within a gas-flow stage in situ in the transmission electron microscope

    SciTech Connect (OSTI)

    Colby, Robert J.; Alsem, Daan H.; Liyu, Andrey V.; Kabius, Bernd C.

    2015-06-01

    The development of environmental transmission electron microscopy (TEM) has enabled in situ experiments in a gaseous environment with high resolution imaging and spectroscopy. Addressing scientific challenges in areas such as catalysis, corrosion, and geochemistry can require pressures much higher than the ~20 mbar achievable with a differentially pumped, dedicated environmental TEM. Gas flow stages, in which the environment is contained between two semi-transparent thin membrane windows, have been demonstrated at pressures of several atmospheres. While this constitutes significant progress towards operando measurements, the design of many current gas flow stages is such that the pressure at the sample cannot necessarily be directly inferred from the pressure differential across the system. Small differences in the setup and design of the gas flow stage can lead to very different sample pressures. We demonstrate a method for measuring the gas pressure directly, using a combination of electron energy loss spectroscopy and TEM imaging. This method requires only two energy filtered TEM images, limiting the measurement time to a few seconds and can be performed during an ongoing experiment at the region of interest. This approach provides a means to ensure reproducibility between different experiments, and even between very differently designed gas flow stages.

  17. A high-resolution field-emission-gun, scanning electron microscope investigation of anisotropic hydrogen decrepitation in Nd-Fe-B-based sintered magnets

    SciTech Connect (OSTI)

    Soderznik, Marko; McGuiness, Paul; Zuzek-Rozman, Kristina; Kobe, Spomenka; Skulj, Irena; Yan Gaolin

    2010-05-15

    In this investigation commercial magnets based on (Nd,Dy){sub 14}(Fe,Co){sub 79}B{sub 7} were prepared by a conventional powder-metallurgy route with a degree of alignment equal to {approx}90% and then exposed to hydrogen at a pressure of 1 bar. The magnets, in the form of cylinders, were observed to decrepitate exclusively from the ends. High-resolution electron microscopy was able to identify the presence of crack formation within the Nd{sub 2}Fe{sub 14}B grains, with the cracks running parallel to the c axis of these grains. Based on the concentration profile for hydrogen in a rare-earth transition-metal material, it is clear that the presence of hydrogen-induced cracks running perpendicular to the ends of the magnet provides for a much more rapidly progressing hydrogen front in this direction than from the sides of the magnet. This results in the magnet exhibiting a macroscopic tendency to decrepitate from the poles of the magnet toward the center. This combination of microstructural modification via particle alignment as part of the sintering process and direct observation via high-resolution electron microscopy has led to a satisfying explanation for the anisotropic hydrogen-decrepitation effect.

  18. Comparative electron microscopic study of chromosomes and interphase nuclei in cells of Cyclops kolensis (Copepoda, Crustacea) before and after chromatin diminution

    SciTech Connect (OSTI)

    Grishanin, A.K.

    1995-05-01

    Using light and electron microscopy, several characteristics of the interphase nuclei and mitotic chromosomes in embryonic cells Cyclops kolensis (Lill) before and after chromatin diminution were studied. We detected a reduction, as a result of chromatin diminution, of one of the two nucleoli in somatic cells. However, the ratio of the total diameter of the nucleoli to the diameter of the nucleus or to the diameter of the cell remained unchanged. Granules of the chromatin to be eliminated became visible in the somatic cells of the C. kolensis embryos at the interphase of the fourth cleavage division. The structure of interphase nuclei and mitotic chromosomes of somatic cells of C. kolensis embryos is different before and after chromatin diminution. Possible mechanisms underlying these differences are discussed. 13 refs., 6 figs., 1 tab.

  19. Solid-state optical microscope

    DOE Patents [OSTI]

    Young, I.T.

    1981-01-07

    A solid state optical microscope is described wherein wide-field and high-resolution images of an object are produced at a rapid rate by utilizing conventional optics with a charge-coupled photodiode array. Means for scanning in one of two orthogonal directions are provided, while the charge-coupled photodiode array scans in the other orthogonal direction. Illumination light from the object is incident upon the photodiodes, creating packets of electrons (signals) which are representative of the illuminated object. The signals are then processed, stored in a memory, and finally displayed as a video signal.

  20. Microscope collision protection apparatus

    DOE Patents [OSTI]

    DeNure, Charles R.

    2001-10-23

    A microscope collision protection apparatus for a remote control microscope which protects the optical and associated components from damage in the event of an uncontrolled collision with a specimen, regardless of the specimen size or shape. In a preferred embodiment, the apparatus includes a counterbalanced slide for mounting the microscope's optical components. This slide replaces the rigid mounts on conventional upright microscopes with a precision ball bearing slide. As the specimen contacts an optical component, the contacting force will move the slide and the optical components mounted thereon. This movement will protect the optical and associated components from damage as the movement causes a limit switch to be actuated, thereby stopping all motors responsible for the collision.

  1. Infrared microscope inspection apparatus

    DOE Patents [OSTI]

    Forman, S.E.; Caunt, J.W.

    1985-02-26

    Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.

  2. Infrared microscope inspection apparatus

    DOE Patents [OSTI]

    Forman, Steven E.; Caunt, James W.

    1985-02-26

    Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface.

  3. Acoustic imaging microscope

    DOE Patents [OSTI]

    Deason, Vance A.; Telschow, Kenneth L.

    2006-10-17

    An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

  4. Ion photon emission microscope

    DOE Patents [OSTI]

    Doyle, Barney L.

    2003-04-22

    An ion beam analysis system that creates microscopic multidimensional image maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the ion-induced photons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted photons are collected in the lens system of a conventional optical microscope, and projected on the image plane of a high resolution single photon position sensitive detector. Position signals from this photon detector are then correlated in time with electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these photons initially.

  5. Atomic Force Microscope

    SciTech Connect (OSTI)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  6. Low frequency acoustic microscope

    DOE Patents [OSTI]

    Khuri-Yakub, Butrus T.

    1986-11-04

    A scanning acoustic microscope is disclosed for the detection and location of near surface flaws, inclusions or voids in a solid sample material. A focused beam of acoustic energy is directed at the sample with its focal plane at the subsurface flaw, inclusion or void location. The sample is scanned with the beam. Detected acoustic energy specularly reflected and mode converted at the surface of the sample and acoustic energy reflected by subsurface flaws, inclusions or voids at the focal plane are used for generating an interference signal which is processed and forms a signal indicative of the subsurface flaws, inclusions or voids.

  7. The Future of Electron Microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei

    2015-05-06

    Berkeley Lab scientist Haimei Zheng discusses the future of electron microscopy and her breakthrough research into examining liquids using an electron microscope.

  8. Imaging arrangement and microscope

    DOE Patents [OSTI]

    Pertsinidis, Alexandros; Chu, Steven

    2015-12-15

    An embodiment of the present invention is an imaging arrangement that includes imaging optics, a fiducial light source, and a control system. In operation, the imaging optics separate light into first and second tight by wavelength and project the first and second light onto first and second areas within first and second detector regions, respectively. The imaging optics separate fiducial light from the fiducial light source into first and second fiducial light and project the first and second fiducial light onto third and fourth areas within the first and second detector regions, respectively. The control system adjusts alignment of the imaging optics so that the first and second fiducial light projected onto the first and second detector regions maintain relatively constant positions within the first and second detector regions, respectively. Another embodiment of the present invention is a microscope that includes the imaging arrangement.

  9. Electron

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    density measurement by differential interferometry W. X. Ding, D. L. Brower, B. H. Deng, and T. Yates Electrical Engineering Department, University of California-Los Angeles, Los Angeles, California 90095 ͑Received 5 May 2006; presented on 10 May 2006; accepted 16 June 2006; published online 26 September 2006͒ A novel differential interferometer is being developed to measure the electron density gradient and its fluctuations. Two separate laser beams with slight spatial offset and frequency

  10. Electron

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron thermal transport within magnetic islands in the reversed-field pinch a... H. D. Stephens, 1,b͒ D. J. Den Hartog, 1,3 C. C. Hegna, 1,2 and J. A. Reusch 1 1 Department of Physics, University of Wisconsin-Madison, 1150 University Ave., Madison, Wisconsin 53706, USA 2 Department of Engineering Physics, University of Wisconsin-Madison, 1500 Engineering Drive, Madison, Wisconsin 53706, USA 3 Center for Magnetic Self-Organization in Laboratory and Astrophysical Plasmas, University of

  11. Scientists View Battery Under Microscope

    SciTech Connect (OSTI)

    2015-04-10

    PNNL researchers use a special microscope setup that shows the inside of a battery as it charges and discharges. This battery-watching microscope is located at EMSL, DOE's Environmental Molecular Sciences Laboratory that resides at PNNL. Researchers the world over can visit EMSL and use special instruments like this, many of which are the only one of their kind available to scientists.

  12. HIGH TEMPERATURE MICROSCOPE AND FURNACE

    DOE Patents [OSTI]

    Olson, D.M.

    1961-01-31

    A high-temperature microscope is offered. It has a reflecting optic situated above a molten specimen in a furnace and reflecting the image of the same downward through an inert optic member in the floor of the furnace, a plurality of spaced reflecting plane mirrors defining a reflecting path around the furnace, a standard microscope supported in the path of and forming the end terminus of the light path.

  13. Microscopic Description of Induced Nuclear Fission (Conference...

    Office of Scientific and Technical Information (OSTI)

    Microscopic Description of Induced Nuclear Fission Citation Details In-Document Search Title: Microscopic Description of Induced Nuclear Fission You are accessing a document ...

  14. Fourth Fridays Downtown - Under the Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    the Microscope: Explore the natural world through the eyes of microscopes. Examine pond water, plants, fibers, pollen, and more. August 28 - Robotics Night at the Museum: Try...

  15. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Disorder-Induced Microscopic Magnetic Memory Print Wednesday, 26 October 2005 00:00 The magnetic-recording industry deliberately...

  16. Nanodomain induced anomalous magnetic and electronic transport properties of LaBaCo{sub 2}O{sub 5.5+?} highly epitaxial thin films

    SciTech Connect (OSTI)

    Ruiz-Zepeda, F.; Ma, C.; Bahena Uribe, D.; Cantu-Valle, J.; Wang, H.; Xu, Xing; Yacaman, M. J.; Ponce, A.; Chen, C.; Lorenz, B.; Jacobson, A. J.; Chu, P. C. W.

    2014-01-14

    A giant magnetoresistance effect (?46% at 20?K under 7?T) and anomalous magnetic properties were found in a highly epitaxial double perovskite LaBaCo{sub 2}O{sub 5.5+?} (LBCO) thin film on (001) MgO. Aberration-corrected Electron Microscopy and related analytical techniques were employed to understand the nature of these unusual physical properties. The as-grown film is epitaxial with the c-axis of the LBCO structure lying in the film plane and with an interface relationship given by (100){sub LBCO} || (001){sub MgO} and [001]{sub LBCO} || [100]{sub MgO} or [010]{sub MgO}. Orderly oxygen vacancies were observed by line profile electron energy loss spectroscopy and by atomic resolution imaging. Especially, oxygen vacancy and nanodomain structures were found to have a crucial effect on the electronic transport and magnetic properties.

  17. Long working distance interference microscope

    DOE Patents [OSTI]

    Sinclair, Michael B.; DeBoer, Maarten P.; Smith, Norman F.

    2004-04-13

    Disclosed is a long working distance interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. The long working distance of 10-30 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-D height profiles of MEMS test structures to be acquired across an entire wafer. A well-matched pair of reference/sample objectives is not required, significantly reducing the cost of this microscope, as compared to a Linnik microinterferometer.

  18. Surface determination through atomically resolved secondary-electron imaging

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Ciston, J.; Brown, H. G.; D’Alfonso, A. J.; Koirala, P.; Ophus, C.; Lin, Y.; Suzuki, Y.; Inada, H.; Zhu, Y.; Allen, L. J.; et al

    2015-06-17

    We report that unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we show a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 x 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our workmore » reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Lastly, dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.« less

  19. Scanning Tunneling Microscope Data Acquistion and Control System

    Energy Science and Technology Software Center (OSTI)

    1995-02-01

    SHOESCAN is a PC based code that acquires and displays data for Scanning Tunneling Microscopes (STM). SHOESCAN interfaces with the STM through external electronic feedback and raster control circuits that are controlled by I/O boards on the PC bus. Data is displayed on a separate color monitor that is interfaced to the PC through an additional frame-grabber board. SHOESCAN can acquire a wide range of surface topographic information as well as surface electronic structure information.

  20. Scanning tunneling microscope nanoetching method

    DOE Patents [OSTI]

    Li, Yun-Zhong; Reifenberger, Ronald G.; Andres, Ronald P.

    1990-01-01

    A method is described for forming uniform nanometer sized depressions on the surface of a conducting substrate. A tunneling tip is used to apply tunneling current density sufficient to vaporize a localized area of the substrate surface. The resulting depressions or craters in the substrate surface can be formed in information encoding patterns readable with a scanning tunneling microscope.

  1. Hyperbaric Hydrothermal Atomic Force Microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2003-07-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  2. Hyperbaric hydrothermal atomic force microscope

    DOE Patents [OSTI]

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2002-01-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  3. NREL: Measurements and Characterization - Scanning Electron Microscopy

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Researcher using field-emission scanning electron microscope. Field emission scanning electron microscope (FE-SEM) JEOL 6320F. This FE-SEM equipped with a cold field-emission source and in-lens detectors is designed for ultra-high resolution at low accelerating voltage. Compositional mapping by energy-dispersive microscopy and Electron Backscattered Diffraction are available. In basic scanning electron microscopy (SEM), a beam of highly energetic (0.1-50 keV) electrons is

  4. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2006-08-22

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  5. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V. C.; Wang, Chengpu

    2003-01-01

    An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

  6. Sensing mode atomic force microscope

    DOE Patents [OSTI]

    Hough, Paul V.; Wang, Chengpu

    2004-11-16

    An atomic force microscope is described having a cantilever comprising a base and a probe tip on an end opposite the base; a cantilever drive device connected to the base; a magnetic material coupled to the probe tip, such that when an incrementally increasing magnetic field is applied to the magnetic material an incrementally increasing force will be applied to the probe tip; a moveable specimen base; and a controller constructed to obtain a profile height of a specimen at a point based upon a contact between the probe tip and a specimen, and measure an adhesion force between the probe tip and the specimen by, under control of a program, incrementally increasing an amount of a magnetic field until a release force, sufficient to break the contact, is applied. An imaging method for atomic force microscopy involving measuring a specimen profile height and adhesion force at multiple points within an area and concurrently displaying the profile and adhesion force for each of the points is also described. A microscope controller is also described and is constructed to, for a group of points, calculate a specimen height at a point based upon a cantilever deflection, a cantilever base position and a specimen piezo position; calculate an adhesion force between a probe tip and a specimen at the point by causing an incrementally increasing force to be applied to the probe tip until the probe tip separates from a specimen; and move the probe tip to a new point in the group.

  7. Characterization of patinas by means of microscopic techniques

    SciTech Connect (OSTI)

    Vazquez-Calvo, C.

    2007-11-15

    Many stone-made historic buildings have a yellowish layer called 'patina' on their external surface. In some cases, it is due to the natural ageing of the stone caused by chemical-physical reactions between the surface of the stone and the environment, and in other cases it is the result of biological activity. The origin of these patinas can be also be due to ancient protective treatments. The use of organic additives, such as protein-based compounds, in lime or gypsum-based patinas is a traditional technique, which has been used in past centuries for the conservation and protection of stone materials. The thinness of the patinas ensures that microscopic techniques are irreplaceable for their analysis. Optical Microscopy, Fluorescence Microscopy, Scanning Electron Microscopy together with an Energy Dispersive X-ray Spectrometer, and Electron Microprobe are the microscopic techniques used for the characterization of these coverings, providing very useful information on their composition, texture and structure.

  8. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    ... and yttria stabilised zirconia substrates is demonstrated using aberration-corrected scanning transmission electron microscopy combined with electron energy-loss spectroscopy. ...

  9. Cerium reduction at the interface between ceria and yttria-stabilised...

    Office of Scientific and Technical Information (OSTI)

    and yttria stabilised zirconia substrates is demonstrated using aberration-corrected scanning transmission electron microscopy combined with electron energy-loss spectroscopy. ...

  10. Frontiers of in situ electron microscopy

    SciTech Connect (OSTI)

    Zheng, Haimei; Zhu, Yimei; Meng, Shirley Ying

    2015-01-01

    In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by in this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.

  11. Fourth Fridays Downtown - Under the Microscope

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Fourth Fridays Downtown - Under the Microscope Fourth Fridays Downtown - Under the Microscope WHEN: Jul 24, 2015 4:00 PM - 6:00 PM WHERE: Bradbury Science Museum 1350 Central Ave, Los Alamos, NM 87544, USA CONTACT: Jessica Privette 505 667-0375 CATEGORY: Bradbury INTERNAL: Calendar Login Under the Microscope Event Description The museum will be open late until 6pm every Fourth Friday offering extended access to exhibits, special programming, and activities. The Los Alamos Creative District is

  12. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Disorder-Induced Microscopic Magnetic Memory Print Wednesday, 26 October 2005 00:00 The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over

  13. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired...

  14. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Schultz, Peter G.; Wei, Tao

    2003-01-01

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  15. Scanning evanescent electro-magnetic microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen

    2001-01-01

    A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.

  16. New High-Capability Solid-State Electron Microscope Detector...

    Office of Science (SC) Website

    ... as a collaboration between SMG's group and Area Detector Systems Corp. (Poway, CA) under ... Collaborations, Non-DOE Interagency Collaboration Last modified: 7262016 9:51:05

  17. In-situ optical transmission electron microscope study of exciton...

    Office of Scientific and Technical Information (OSTI)

    Authors: Yang, Shize 1 ; Institute of Physics, Chinese Academy of Sciences, Beijing ... Innovation Center of Quantum Matter, Beijing (China) (China) Institute of Physics, ...

  18. Robotic CCD microscope for enhanced crystal recognition

    DOE Patents [OSTI]

    Segelke, Brent W.; Toppani, Dominique

    2007-11-06

    A robotic CCD microscope and procedures to automate crystal recognition. The robotic CCD microscope and procedures enables more accurate crystal recognition, leading to fewer false negative and fewer false positives, and enable detection of smaller crystals compared to other methods available today.

  19. Surface-structure sensitivity of CeO2 nanocrystals in photocatalysis...

    Office of Scientific and Technical Information (OSTI)

    heterogeneous (photo)catalysis. In this study, using aberration-corrected scanning transmission electron microscopy (STEM), the atomic surface structures of well-defined...

  20. Atomic and electronic structure of the ferroelectric BaTiO{sub 3}/Ge(001) interface

    SciTech Connect (OSTI)

    Fredrickson, Kurt D.; Ponath, Patrick; Posadas, Agham B.; Demkov, Alexander A.; McCartney, Martha R.; Smith, David J.; Aoki, Toshihiro

    2014-06-16

    In this study, we demonstrate the epitaxial growth of BaTiO{sub 3} on Ge(001) by molecular beam epitaxy using a thin Zintl template buffer layer. A combination of density functional theory, atomic-resolution electron microscopy and in situ photoemission spectroscopy is used to investigate the electronic properties and atomic structure of the BaTiO{sub 3}/Ge interface. Aberration-corrected scanning transmission electron micrographs reveal that the Ge(001) 2??1 surface reconstruction remains intact during the subsequent BaTiO{sub 3} growth, thereby enabling a choice to be made between several theoretically predicted interface structures. The measured valence band offset of 2.7?eV matches well with the theoretical value of 2.5?eV based on the model structure for an in-plane-polarized interface. The agreement between the calculated and measured band offsets, which are highly sensitive to the detailed atomic arrangement, indicates that the most likely BaTiO{sub 3}/Ge(001) interface structure has been identified.

  1. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in...

  2. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits...

  3. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  4. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  5. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  6. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Disorder-Induced Microscopic Magnetic Memory Print The magnetic-recording industry deliberately introduces carefully controlled disorder into its materials to obtain the desired magnetic properties. But as the density of magnetic disks climbs, the size of the magnetic domains responsible for storage must decrease, posing new challenges. Beautiful theories based on random microscopic disorder have been developed over the past ten years. To directly compare these theories with precise experiments,

  7. X-ray laser microscope apparatus

    DOE Patents [OSTI]

    Suckewer, Szymon; DiCicco, Darrell S.; Hirschberg, Joseph G.; Meixler, Lewis D.; Sathre, Robert; Skinner, Charles H.

    1990-01-01

    A microscope consisting of an x-ray contact microscope and an optical microscope. The optical, phase contrast, microscope is used to align a target with respect to a source of soft x-rays. The source of soft x-rays preferably comprises an x-ray laser but could comprise a synchrotron or other pulse source of x-rays. Transparent resist material is used to support the target. The optical microscope is located on the opposite side of the transparent resist material from the target and is employed to align the target with respect to the anticipated soft x-ray laser beam. After alignment with the use of the optical microscope, the target is exposed to the soft x-ray laser beam. The x-ray sensitive transparent resist material whose chemical bonds are altered by the x-ray beam passing through the target mater GOVERNMENT LICENSE RIGHTS This invention was made with government support under Contract No. De-FG02-86ER13609 awarded by the Department of Energy. The Government has certain rights in this invention.

  8. Atomic and electronic structures of SrTiO3/GaAs heterointerfaces: An 80-kV atomic-resolution electron energy-loss spectroscopy study

    SciTech Connect (OSTI)

    Qiao, Q.; Klie, Robert F; Ogut, Serdar; Idrobo Tapia, Juan C

    2012-01-01

    We have examined the atomic and electronic structures of epitaxially grown, ultrathin SrTiO{sub 3} (100) films on GaAs (001) using 80-kV aberration-corrected atomic-resolution Z-contrast imaging and electron energy-loss spectroscopy (EELS) to develop a fundamental understanding of the interfacial structure-property relationships. We find that the interface is atomically abrupt and no surface reconstruction of the GaAs (001) surface is observed. Using atomic-column resolved EELS, we examine the oxygen vacancy and Ti concentrations in the SrTiO{sub 3} film and across the heterointerface. We show that Ti diffuses into the first few monolayers of GaAs. Using a combination of EELS and first-principles calculations, we present evidence for the formation of As oxides at the interface depending on the thin-film growth conditions. These findings are used to explain the differences in the transport behavior of the films.

  9. Ultrafast chirped optical waveform recorder using a time microscope...

    Office of Scientific and Technical Information (OSTI)

    DOepatents Search Results Ultrafast chirped optical waveform recorder using a time microscope Title: Ultrafast chirped optical waveform recorder using a time microscope A new ...

  10. Ultrafast chirped optical waveform recorder using a time microscope...

    Office of Scientific and Technical Information (OSTI)

    Data Explorer Search Results Ultrafast chirped optical waveform recorder using a time microscope Title: Ultrafast chirped optical waveform recorder using a time microscope A new ...

  11. Microscopic theory of quantum anomalous Hall effect in graphene...

    Office of Scientific and Technical Information (OSTI)

    Microscopic theory of quantum anomalous Hall effect in graphene Citation Details In-Document Search Title: Microscopic theory of quantum anomalous Hall effect in graphene Authors: ...

  12. Microscopic Description of Nuclear Fission: Fission Barrier Heights...

    Office of Scientific and Technical Information (OSTI)

    Conference: Microscopic Description of Nuclear Fission: Fission Barrier Heights of Even-Even Actinides Citation Details In-Document Search Title: Microscopic Description of Nuclear ...

  13. Microscopic Study Of Alpha + N Bremsstrahlung From Effective...

    Office of Scientific and Technical Information (OSTI)

    Microscopic Study Of Alpha + N Bremsstrahlung From Effective And Realistic Inter-Nucleon Interactions Citation Details In-Document Search Title: Microscopic Study Of Alpha + N ...

  14. Toward Understanding the Microscopic Origin of Nuclear Clustering...

    Office of Scientific and Technical Information (OSTI)

    Toward Understanding the Microscopic Origin of Nuclear Clustering Citation Details In-Document Search Title: Toward Understanding the Microscopic Origin of Nuclear Clustering Open...

  15. Highly charged ion based time of flight emission microscope

    DOE Patents [OSTI]

    Barnes, Alan V.; Schenkel, Thomas; Hamza, Alex V.; Schneider, Dieter H.; Doyle, Barney

    2001-01-01

    A highly charged ion based time-of-flight emission microscope has been designed, which improves the surface sensitivity of static SIMS measurements because of the higher ionization probability of highly charged ions. Slow, highly charged ions are produced in an electron beam ion trap and are directed to the sample surface. The sputtered secondary ions and electrons pass through a specially designed objective lens to a microchannel plate detector. This new instrument permits high surface sensitivity (10.sup.10 atoms/cm.sup.2), high spatial resolution (100 nm), and chemical structural information due to the high molecular ion yields. The high secondary ion yield permits coincidence counting, which can be used to enhance determination of chemical and topological structure and to correlate specific molecular species.

  16. Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy

    SciTech Connect (OSTI)

    Kovcs, A.; Duchamp, M.; Boothroyd, C. B.; Dunin-Borkowski, R. E.; Ney, A.; Ney, V.; Galindo, P. L.; Kaspar, T. C.; Chambers, S. A.

    2013-12-28

    We study planar defects in epitaxial Co:ZnO dilute magnetic semiconductor thin films deposited on c-plane sapphire (Al{sub 2}O{sub 3}), as well as the Co:ZnO/Al{sub 2}O{sub 3} interface, using aberration-corrected transmission electron microscopy and electron energy-loss spectroscopy. Co:ZnO samples that were deposited using pulsed laser deposition and reactive magnetron sputtering are both found to contain extrinsic stacking faults, incoherent interface structures, and compositional variations within the first 34 Co:ZnO layers next to the Al{sub 2}O{sub 3} substrate. The stacking fault density is in the range of 10{sup 17} cm{sup ?3}. We also measure the local lattice distortions around the stacking faults. It is shown that despite the relatively high density of planar defects, lattice distortions, and small compositional variation, the Co:ZnO films retain paramagnetic properties.

  17. Macroscopic model of scanning force microscope

    DOE Patents [OSTI]

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  18. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment A Microscopic Double-Slit Experiment Print Wednesday, 29 February 2012 00:00 Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using

  19. Dynamic imaging with electron microscopy

    ScienceCinema (OSTI)

    Campbell, Geoffrey; McKeown, Joe; Santala, Melissa

    2014-05-30

    Livermore researchers have perfected an electron microscope to study fast-evolving material processes and chemical reactions. By applying engineering, microscopy, and laser expertise to the decades-old technology of electron microscopy, the dynamic transmission electron microscope (DTEM) team has developed a technique that can capture images of phenomena that are both very small and very fast. DTEM uses a precisely timed laser pulse to achieve a short but intense electron beam for imaging. When synchronized with a dynamic event in the microscope's field of view, DTEM allows scientists to record and measure material changes in action. A new movie-mode capability, which earned a 2013 R&D 100 Award from R&D Magazine, uses up to nine laser pulses to sequentially capture fast, irreversible, even one-of-a-kind material changes at the nanometer scale. DTEM projects are advancing basic and applied materials research, including such areas as nanostructure growth, phase transformations, and chemical reactions.

  20. Vertically aligned nanostructure scanning probe microscope tips

    DOE Patents [OSTI]

    Guillorn, Michael A.; Ilic, Bojan; Melechko, Anatoli V.; Merkulov, Vladimir I.; Lowndes, Douglas H.; Simpson, Michael L.

    2006-12-19

    Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

  1. SLAC All Access: X-ray Microscope

    ScienceCinema (OSTI)

    Nelson, Johanna; Liu, Yijin

    2014-06-13

    SLAC physicists Johanna Nelson and Yijin Liu give a brief overview of the X-ray microscope at the Stanford Synchrotron Radiation Lightsource (SSRL) that is helping improve rechargeable-battery technology by letting researchers peek into the inner workings of batteries as they operate.

  2. Fast electron microscopy via compressive sensing

    DOE Patents [OSTI]

    Larson, Kurt W; Anderson, Hyrum S; Wheeler, Jason W

    2014-12-09

    Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

  3. Note: Long-range scanning tunneling microscope for the study of nanostructures on insulating substrates

    SciTech Connect (OSTI)

    Molina-Mendoza, Aday J.; Rodrigo, Jos G.; Rubio-Bollinger, Gabino; Island, Joshua; Burzuri, Enrique; Zant, Herre S. J. van der; Agrat, Nicols; Condensed Matter Physics Center and Instituto Universitario de Ciencia de Materiales Nicols Cabrera, Universidad Autnoma de Madrid, Campus de Cantoblanco, E-28049 Madrid; Instituto Madrileo de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, E-28049 Madrid

    2014-02-15

    The scanning tunneling microscope (STM) is a powerful tool for studying the electronic properties at the atomic level, however, it is of relatively small scanning range and the fact that it can only operate on conducting samples prevents its application to study heterogeneous samples consisting of conducting and insulating regions. Here we present a long-range scanning tunneling microscope capable of detecting conducting micro and nanostructures on insulating substrates using a technique based on the capacitance between the tip and the sample and performing STM studies.

  4. Revealing the atomic and electronic structure of a SrTiO{sub 3}/LaNiO{sub 3}/SrTiO{sub 3} heterostructure interface

    SciTech Connect (OSTI)

    Zhang, Zaoli; Soltan, S.; Schmid, H.; Habermeier, H.-U.; Keimer, B.; Kaiser, U.

    2014-03-14

    The atomic structures of SrTiO{sub 3} (STO)/LaNiO{sub 3} (LNO)/STO heterostructure interfaces were investigated by spherical aberration-corrected (C{sub S}) (scanning) transmission electron microscopy. Atomic displacement and lattice distortion measurements and electron energy loss spectroscopy (EELS) were used to quantitatively analyze the distortion of the interfacial octahedra and the bond length at the interfaces. Combined with high-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy analyses, two distinct interfacial atomic terminating layers are unambiguously determined. Ensuing quantitative HRTEM measurements revealed that the Ni-O bond length in the interfacial octahedral is elongated at the bottom interface (NiO{sub 2}-SrO). Atomic displacement shows structural relaxation effects when crossing the interfaces and lattice distortions across the interface is more pronounced in LNO than in STO. The Ti/O atomic ratio, La and Ti relative atomic ratio as derived by EELS quantification indicate non-stoichiometric composition at the interfaces. Distinct fine structures of Ti-L{sub 2,3} edge and O-K edge at the bottom and top interfaces are observed. By comparison, we are able to estimate Ti valency at both interfaces. Combining the structural distortions and Ti valency, the polar discontinuity and charge transfer at the interfaces are discussed.

  5. Identification of microscopic hole-trapping mechanisms in nitride semiconductors

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    John L. Lyons; Krishnaswamy, Karthik; Luke Gordon; Van de Walle, Chris G.; Anderson, Janotti

    2015-12-17

    Hole trapping has been observed in nitride heterostructure devices, where the Fermi level is in the vicinity of the valence-band maximum. Using hybrid density functional calculations, we examine microscopic mechanisms for hole trapping in GaN and AlN. In a defect-free material, hole trapping does not spontaneously occur, but trapping can occur in the vicinity of impurities, such as C-a common unintentional impurity in nitrides. As a result, using Schrödinger-Poisson simulations, we assess the effects of C-derived hole traps on N-face high-electron mobility transistors, which we find to be more detrimental than the previously proposed interface traps.

  6. Scanning tunneling microscope assembly, reactor, and system

    DOE Patents [OSTI]

    Tao, Feng; Salmeron, Miquel; Somorjai, Gabor A

    2014-11-18

    An embodiment of a scanning tunneling microscope (STM) reactor includes a pressure vessel, an STM assembly, and three spring coupling objects. The pressure vessel includes a sealable port, an interior, and an exterior. An embodiment of an STM system includes a vacuum chamber, an STM reactor, and three springs. The three springs couple the STM reactor to the vacuum chamber and are operable to suspend the scanning tunneling microscope reactor within the interior of the vacuum chamber during operation of the STM reactor. An embodiment of an STM assembly includes a coarse displacement arrangement, a piezoelectric fine displacement scanning tube coupled to the coarse displacement arrangement, and a receiver. The piezoelectric fine displacement scanning tube is coupled to the coarse displacement arrangement. The receiver is coupled to the piezoelectric scanning tube and is operable to receive a tip holder, and the tip holder is operable to receive a tip.

  7. Ultra high frequency imaging acoustic microscope

    DOE Patents [OSTI]

    Deason, Vance A.; Telschow, Kenneth L.

    2006-05-23

    An imaging system includes: an object wavefront source and an optical microscope objective all positioned to direct an object wavefront onto an area of a vibrating subject surface encompassed by a field of view of the microscope objective, and to direct a modulated object wavefront reflected from the encompassed surface area through a photorefractive material; and a reference wavefront source and at least one phase modulator all positioned to direct a reference wavefront through the phase modulator and to direct a modulated reference wavefront from the phase modulator through the photorefractive material to interfere with the modulated object wavefront. The photorefractive material has a composition and a position such that interference of the modulated object wavefront and modulated reference wavefront occurs within the photorefractive material, providing a full-field, real-time image signal of the encompassed surface area.

  8. Commissioning of the PRIOR proton microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Varentsov, D.; Antonov, O.; Bakhmutova, A.; Barnes, C. W.; Bogdanov, A.; Danly, C. R.; Efimov, S.; Endres, M.; Fertman, A.; Golubev, A. A.; et al

    2016-02-18

    Recently, a new high energy proton microscopy facility PRIOR (Proton Microscope for FAIR Facility for Anti-proton and Ion Research) has been designed, constructed, and successfully commissioned at GSI Helmholtzzentrum für Schwerionenforschung (Darmstadt, Germany). As a result of the experiments with 3.5–4.5 GeV proton beams delivered by the heavy ion synchrotron SIS-18 of GSI, 30 μm spatial and 10 ns temporal resolutions of the proton microscope have been demonstrated. A new pulsed power setup for studying properties of matter under extremes has been developed for the dynamic commissioning of the PRIOR facility. This study describes the PRIOR setup as well asmore » the results of the first static and dynamic protonradiography experiments performed at GSI.« less

  9. Microscopic analysis of non-equilibrium dynamics in the semiconductor-laser gain medium

    SciTech Connect (OSTI)

    Hader, J.; Moloney, J. V.; Koch, S. W.

    2014-04-14

    Fully microscopic many-body calculations are used to analyze the carrier dynamics in situations where a strong sub-picosecond pulse interacts with an inverted semiconductor quantum well. Electron-electron and electron-phonon scatterings are calculated on a second Born-Markov level. Intra-subband scatterings on a scale of tens of femtoseconds are shown to quickly re-fill the kinetic holes created in the carrier distributions during the pulse amplification. Even for sub-100 fs pulses, this significantly influences the pulse amplification as well as its spectral dependence. Interband scatterings on a few picosecond timescale limit the possibly achievable repetition rate in pulsed semiconductor lasers.

  10. Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Microscopic Theory of Fission Citation Details In-Document Search Title: Microscopic Theory of Fission You are accessing a document from the Department of Energy's (DOE) SciTech ...

  11. 3D Printed Microscope for Mobile Devices that Cost Pennies

    ScienceCinema (OSTI)

    Erikson, Rebecca; Baird, Cheryl; Hutchinson, Janine

    2015-06-23

    Scientists at PNNL have designed a 3D-printable microscope for mobile devices using pennies worth of plastic and glass materials. The microscope has a wide range of uses, from education to in-the-field science.

  12. 3D Printed Microscope for Mobile Devices that Cost Pennies

    SciTech Connect (OSTI)

    Erikson, Rebecca; Baird, Cheryl; Hutchinson, Janine

    2014-09-15

    Scientists at PNNL have designed a 3D-printable microscope for mobile devices using pennies worth of plastic and glass materials. The microscope has a wide range of uses, from education to in-the-field science.

  13. Plasmons in molecules: Microscopic characterization based on orbital transitions and momentum conservation

    SciTech Connect (OSTI)

    Krauter, Caroline M.; Schirmer, Jochen; Pernpointner, Markus; Jacob, Christoph R.; Dreuw, Andreas

    2014-09-14

    In solid state physics, electronic excitations are often classified as plasmons or single-particle excitations. The former class of states refers to collective oscillations of the electron density. The random-phase approximation allows for a quantum-theoretical treatment and a characterization on a microscopic level as a coherent superposition of a large number of particle-hole transitions with the same momentum transfer. However, small systems such as molecules or small nanoclusters lack the basic properties (momentum conservation and uniform exchange interaction) responsible for the formation of plasmons in the solid-state case. Despite an enhanced interest in plasmon-based technologies and an increasing number of studies regarding plasmons in molecules and small nanoclusters, their definition on a microscopic level of theory remains ambiguous. In this work, we analyze the microscopic properties of molecular plasmons in comparison with the homogeneous electron gas as a model system. Subsequently, the applicability of the derived characteristics is validated by analyzing the electronic excitation vectors with respect to orbital transitions for two linear polyenes within second order versions of the algebraic diagrammatic construction scheme for the polarization propagator.

  14. Smart align -- A new tool for robust non-rigid registration of scanning microscope data

    SciTech Connect (OSTI)

    Jones, Lewys; Yang, Hao; Pennycook, Timothy J.; Marshall, Matthew S. J.; Van Aert, Sandra; Browning, Nigel D.; Castell, Martin R.; Nellist, Peter D.

    2015-07-10

    Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the careful alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated.

  15. Smart align -- A new tool for robust non-rigid registration of scanning microscope data

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Jones, Lewys; Yang, Hao; Pennycook, Timothy J.; Marshall, Matthew S. J.; Van Aert, Sandra; Browning, Nigel D.; Castell, Martin R.; Nellist, Peter D.

    2015-07-10

    Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the carefulmore » alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated.« less

  16. Scanning tip microwave near field microscope

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Schultz, Peter G.; Wei, Tao

    1998-01-01

    A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.

  17. Scanning tip microwave near field microscope

    DOE Patents [OSTI]

    Xiang, X.D.; Schultz, P.G.; Wei, T.

    1998-10-13

    A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an end wall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity. 17 figs.

  18. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  19. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  20. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    A Microscopic Double-Slit Experiment Print Two centuries ago, Thomas Young performed the classic demonstration of the wave nature of light. He placed a screen with two tiny slits in front of a single light source, effectively converting it into a two-centered source. On a second screen far away, he saw a pattern of light and dark diffraction fringes, a well-known hallmark of wave interference. Along with later studies using particles instead of light, the experiment played a crucial role in

  1. Acoustic microscope surface inspection system and method

    DOE Patents [OSTI]

    Khuri-Yakub, Butrus T.; Parent, Philippe; Reinholdtsen, Paul A.

    1991-01-01

    An acoustic microscope surface inspection system and method in which pulses of high frequency electrical energy are applied to a transducer which forms and focuses acoustic energy onto a selected location on the surface of an object and receives energy from the location and generates electrical pulses. The phase of the high frequency electrical signal pulses are stepped with respected to the phase of a reference signal at said location. An output signal is generated which is indicative of the surface of said selected location. The object is scanned to provide output signals representative of the surface at a plurality of surface locations.

  2. Acoustic microscope surface inspection system and method

    DOE Patents [OSTI]

    Khuri-Yakub, B.T.; Parent, P.; Reinholdtsen, P.A.

    1991-02-26

    An acoustic microscope surface inspection system and method are described in which pulses of high frequency electrical energy are applied to a transducer which forms and focuses acoustic energy onto a selected location on the surface of an object and receives energy from the location and generates electrical pulses. The phase of the high frequency electrical signal pulses are stepped with respect to the phase of a reference signal at said location. An output signal is generated which is indicative of the surface of said selected location. The object is scanned to provide output signals representative of the surface at a plurality of surface locations. 7 figures.

  3. Disorder-Induced Microscopic Magnetic Memory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    to the orientation of the electron spin, this resonant scattering process is the quantum analogue of the classical Faraday effect. Coherent x rays, produced by passing them...

  4. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    photoionization cross-section would oscillate around a value predicted by the Franck-Condon principle, which governs the likelihood of transitions involving electronic and...

  5. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    modeling into a widely applicable structural tool for electron interferometry and holography by capitalizing on coherent photoemission. These multicenter interferences in the...

  6. A Microscopic Double-Slit Experiment

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    ... of detection technique and advanced modeling into a widely applicable structural tool for electron interferometry and holography by capitalizing on coherent photoemission. ...

  7. Atomic configuration of irradiation-induced planar defects in 3C-SiC

    SciTech Connect (OSTI)

    Lin, Y. R. [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); National Synchrotron Radiation Center, 101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu 30076, Taiwan (China); Ho, C. Y. [Institute of Nuclear Engineering and Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Hsieh, C. Y.; Chang, M. T.; Lo, S. C. [Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, Taiwan (China); Chen, F. R. [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Kai, J. J., E-mail: ceer0001@gmail.com [Department of Engineering and System Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China); Institute of Nuclear Engineering and Science, National Tsing-Hua University, Hsinchu 30013, Taiwan (China)

    2014-03-24

    The atomic configuration of irradiation-induced planar defects in single crystal 3C-SiC at high irradiation temperatures was shown in this research. A spherical aberration corrected scanning transmission electron microscope provided images of individual silicon and carbon atoms by the annular bright-field (ABF) method. Two types of irradiation-induced planar defects were observed in the ABF images including the extrinsic stacking fault loop with two offset Si-C bilayers and the intrinsic stacking fault loop with one offset Si-C bilayer. The results are in good agreement with images simulated under identical conditions.

  8. Imaging individual lanthanum atoms in zeolite Y by scanning transmission electron microscopy: evidence of lanthanum pair sites

    SciTech Connect (OSTI)

    Xu, Pinghong; Lu, Jing; Aydin, C.; Debefve, Louise M.; Browning, Nigel D.; Chen, Cong-Yan; Gates, Bruce C.

    2015-09-01

    Images of La-exchanged NaY zeolite obtained with aberration-corrected scanning transmission electron microscopy (STEM) show that about 80% of the La cations were present as site-isolated species, with the remainder in pair sites. The distance between La cations in the pair sites ranged from 1.44 to 3.84 Å, consistent with the presence of pairs of cations tilted at various angles with respect to the support surface. The actual distance between La cations in the pair sites is inferred to be approximately 3.84 Å, which is shorter than the distance between the nearest Al sites in the zeolite (4.31 Å). The results therefore suggest the presence of dimeric structures of La cations bridged with OH groups, and the presence of such species has been inferred previously on the basis of X-ray photoelectron spectroscopy (W. Grünert, U. Sauerlandt, R. Schlögl, H.G. Karge, J. Phys. Chem., 97 (1993) 1413).

  9. Microscopic origin of volume modulus inflation

    SciTech Connect (OSTI)

    Cicoli, Michele; Muia, Francesco; Pedro, Francisco Gil

    2015-12-21

    High-scale string inflationary models are in well-known tension with low-energy supersymmetry. A promising solution involves models where the inflaton is the volume of the extra dimensions so that the gravitino mass relaxes from large values during inflation to smaller values today. We describe a possible microscopic origin of the scalar potential of volume modulus inflation by exploiting non-perturbative effects, string loop and higher derivative perturbative corrections to the supergravity effective action together with contributions from anti-branes and charged hidden matter fields. We also analyse the relation between the size of the flux superpotential and the position of the late-time minimum and the inflection point around which inflation takes place. We perform a detailed study of the inflationary dynamics for a single modulus and a two moduli case where we also analyse the sensitivity of the cosmological observables on the choice of initial conditions.

  10. Long working distance incoherent interference microscope

    DOE Patents [OSTI]

    Sinclair, Michael B.; De Boer, Maarten P.

    2006-04-25

    A full-field imaging, long working distance, incoherent interference microscope suitable for three-dimensional imaging and metrology of MEMS devices and test structures on a standard microelectronics probe station. A long working distance greater than 10 mm allows standard probes or probe cards to be used. This enables nanometer-scale 3-dimensional height profiles of MEMS test structures to be acquired across an entire wafer while being actively probed, and, optionally, through a transparent window. An optically identical pair of sample and reference arm objectives is not required, which reduces the overall system cost, and also the cost and time required to change sample magnifications. Using a LED source, high magnification (e.g., 50.times.) can be obtained having excellent image quality, straight fringes, and high fringe contrast.

  11. Three-dimensional scanning confocal laser microscope

    DOE Patents [OSTI]

    Anderson, R. Rox; Webb, Robert H.; Rajadhyaksha, Milind

    1999-01-01

    A confocal microscope for generating an image of a sample includes a first scanning element for scanning a light beam along a first axis, and a second scanning element for scanning the light beam at a predetermined amplitude along a second axis perpendicular to the first axis. A third scanning element scans the light beam at a predetermined amplitude along a third axis perpendicular to an imaging plane defined by the first and second axes. The second and third scanning element are synchronized to scan at the same frequency. The second and third predetermined amplitudes are percentages of their maximum amplitudes. A selector determines the second and third predetermined amplitudes such that the sum of the percentages is equal to one-hundred percent.

  12. Synchrotron radiation infrared microscopic study of non-bridging...

    Office of Scientific and Technical Information (OSTI)

    Title: Synchrotron radiation infrared microscopic study of non-bridging oxygen modes associated with laser-induced breakdown of fused silica Authors: Matthews, M J ; Carr, C W ; ...

  13. Microscopic description of fission dynamics: finite element method...

    Office of Scientific and Technical Information (OSTI)

    Title: Microscopic description of fission dynamics: finite element method resolution of ... This site is a product of DOE's Office of Scientific and Technical Information (OSTI) and ...

  14. Microscopic Study Of Alpha + N Bremsstrahlung From Effective...

    Office of Scientific and Technical Information (OSTI)

    Of Alpha + N Bremsstrahlung From Effective And Realistic Inter-Nucleon Interactions Citation Details In-Document Search Title: Microscopic Study Of Alpha + N Bremsstrahlung ...

  15. Braking system for use with an arbor of a microscope

    DOE Patents [OSTI]

    Norgren, Duane U.

    1984-01-01

    A balanced braking system comprising a plurality of braking assemblies located about a member to be braked. Each of the braking assemblies consists of a spring biased piston of a first material fitted into a body of a different material which has a greater contraction upon cooling than the piston material. The piston is provided with a recessed head portion over which is positioned a diaphragm and forming a space therebetween to which is connected a pressurized fluid supply. The diaphragm is controlled by the fluid in the space to contact or withdraw from the member to be braked. A cooling device causes the body within which the piston is fitted to contract more than the piston, producing a tight shrink fit therebetween. The braking system is particularly applicable for selectively braking an arbor of an electron microscope which immobilizes, for example, a vertically adjustable low temperature specimen holder during observation. The system provides balanced braking forces which can be easily removed and re-established with minimal disturbance to arbor location.

  16. Fine precipitation scenarios of AlZnMg(Cu) alloys revealed by advanced atomic-resolution electron microscopy study Part II: Fine precipitation scenarios in AlZnMg(Cu) alloys

    SciTech Connect (OSTI)

    Liu, J.Z.; Chen, J.H.; Liu, Z.R.; Wu, C.L.

    2015-01-15

    Although they are among the most important precipitation-hardened materials for industry applications, the high-strength AlZnMg(Cu) alloys have thus far not yet been understood adequately about their underlying precipitation scenarios in relation with the properties. This is partly due to the fact that the structures of a number of different precipitates involved in the alloys are unknown, and partly due to the complexity that the precipitation behaviors of the alloys may be closely related to the alloy's composition. In Part I of the present study, we have determined all the unknown precipitate structures in the alloys. Here in Part II, using atomic-resolution electron microscopy in association with the first principles energy calculations, we further studied and correlated the phase/structure transformation/evolution among these hardening precipitates in relation with the alloy's composition. It is shown that there are actually two coexisting classes of hardening precipitates in these alloys: the first class includes the η′-precipitates and their early-stage Guinier–Preston (GP-η′) zones; the second class includes the precursors of the equilibrium η-phase (referred to η{sub p}, or η-precursor) and their early-stage Guinier–Preston (GP-η{sub p}) zones. The two coexisting classes of precipitates correspond to two precipitation scenarios. - Highlights: • We determine and verify all the key precipitate structures in AlMgZn(Cu) alloys. • We employ aberration-corrected scanning transmission electron microscopy (STEM). • We use aberration-corrected high-resolution TEM (HRTEM) for the investigations. • We obtain atomic-resolution images of the precipitates and model their structures. • We refine all precipitate structures with quantitative image simulation analysis. • The hardening precipitates in AlZnMg alloys shall be classified into two groups. • Two precipitation scenarios coexist in the alloys. • The precipitation behavior of such an

  17. In-situ high resolution transmission electron microscopy observation of silicon nanocrystal nucleation in a SiO{sub 2} bilayered matrix

    SciTech Connect (OSTI)

    Yang, T. C.-J. Wu, L.; Lin, Z.; Jia, X.; Puthen-Veettil, B.; Zhang, T.; Conibeer, G.; Perez-Wurfl, I.; Kauffmann, Y.; Rothschild, A.

    2014-08-04

    Solid-state nucleation of Si nanocrystals in a SiO{sub 2} bilayered matrix was observed at temperatures as low as 450?C. This was achieved by aberration corrected high-resolution transmission electron microscopy (HRTEM) with real-time in-situ heating up to 600?C. This technique is a valuable characterization tool especially with the recent interest in Si nanostructures for light emitting devices, non-volatile memories, and third-generation photovoltaics which all typically require a heating step in their fabrication. The control of size, shape, and distribution of the Si nanocrystals are critical for these applications. This experimental study involves in-situ observation of the nucleation of Si nanocrystals in a SiO{sub 2} bilayered matrix fabricated through radio frequency co-sputtering. The results show that the shapes of Si nanocrystals in amorphous SiO{sub 2} bilayered matrices are irregular and not spherical, in contrast to many claims in the literature. Furthermore, the Si nanocrystals are well confined within their layers by the amorphous SiO{sub 2}. This study demonstrates the potential of in-situ HRTEM as a tool to observe the real time nucleation of Si nanocrystals in a SiO{sub 2} bilayered matrix. Furthermore, ideas for improvements on this in-situ heating HRTEM technique are discussed.

  18. Fragment Yields Calculated in a Time-Dependent Microscopic Theory...

    Office of Scientific and Technical Information (OSTI)

    Fragment Yields Calculated in a Time-Dependent Microscopic Theory of Fission Citation ... Word Cloud More Like This Full Text preview image File size NAView Full Text View Full ...

  19. Long working-distance, incoherent light interference microscope...

    Office of Scientific and Technical Information (OSTI)

    Journal Article: Long working-distance, incoherent light interference microscope Citation ... OSTI Identifier: 973677 Report Number(s): SAND2005-3369J Journal ID: ISSN 0003-6935; ...

  20. Microscopic Calculation of Fission Fragment Energies for the...

    Office of Scientific and Technical Information (OSTI)

    for the 239Pu(nth,f) Reaction Citation Details In-Document Search Title: Microscopic Calculation of Fission Fragment Energies for the 239Pu(nth,f) Reaction We calculate the ...

  1. The Use of Microscopes and Telescopes in IR Imaging (Conference...

    Office of Scientific and Technical Information (OSTI)

    working in a research environment, where applications can vary from week to week. ... In these cases, the thermographer must rely on an IR microscope for close-up work with a ...

  2. High-resolution electron microscopy of advanced materials

    SciTech Connect (OSTI)

    Mitchell, T.E.; Kung, H.H.; Sickafus, K.E.; Gray, G.T. III; Field, R.D.; Smith, J.F.

    1997-11-01

    This final report chronicles a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The High-Resolution Electron Microscopy Facility has doubled in size and tripled in quality since the beginning of the three-year period. The facility now includes a field-emission scanning electron microscope, a 100 kV field-emission scanning transmission electron microscope (FE-STEM), a 300 kV field-emission high-resolution transmission electron microscope (FE-HRTEM), and a 300 kV analytical transmission electron microscope. A new orientation imaging microscope is being installed. X-ray energy dispersive spectrometers for chemical analysis are available on all four microscopes; parallel electron energy loss spectrometers are operational on the FE-STEM and FE-HRTEM. These systems enable evaluation of local atomic bonding, as well as chemical composition in nanometer-scale regions. The FE-HRTEM has a point-to-point resolution of 1.6 {angstrom}, but the resolution can be pushed to its information limit of 1 {angstrom} by computer reconstruction of a focal series of images. HRTEM has been used to image the atomic structure of defects such as dislocations, grain boundaries, and interfaces in a variety of materials from superconductors and ferroelectrics to structural ceramics and intermetallics.

  3. A microscopic theory of low energy fission: fragment properties

    Office of Scientific and Technical Information (OSTI)

    (Conference) | SciTech Connect Conference: A microscopic theory of low energy fission: fragment properties Citation Details In-Document Search Title: A microscopic theory of low energy fission: fragment properties Authors: Younes, W ; Gogny, D ; Schunck, N Publication Date: 2013-01-11 OSTI Identifier: 1062214 Report Number(s): LLNL-PROC-609985 DOE Contract Number: W-7405-ENG-48 Resource Type: Conference Resource Relation: Conference: Presented at: Fifth International Conference on Fission

  4. Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Microscopic Theory of Fission Citation Details In-Document Search Title: Microscopic Theory of Fission Authors: Younes, W ; Gogny, D Publication Date: 2008-01-03 OSTI Identifier: 924187 Report Number(s): LLNL-PROC-400347 DOE Contract Number: W-7405-ENG-48 Resource Type: Conference Resource Relation: Conference: Presented at: Compound Nuclear Reactions and Related Topics, Fish Camp, CA, United States, Oct 22 - Oct 26, 2007 Research Org: Lawrence Livermore National Laboratory (LLNL), Livermore, CA

  5. The Microscopic Theory of Fission (Conference) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Conference: The Microscopic Theory of Fission Citation Details In-Document Search Title: The Microscopic Theory of Fission Fission-fragment properties have been calculated for thermal neutron-induced fission on a {sup 239}Pu target, using constrained Hartree-Fock-Bogoliubov calculations with a finite-range effective interaction. A quantitative criterion based on the interaction energy between the nascent fragments is introduced to define the scission configurations. The validity of this

  6. Phase contrast in high resolution electron microscopy

    DOE Patents [OSTI]

    Rose, H.H.

    1975-09-23

    This patent relates to a device for developing a phase contrast signal for a scanning transmission electron microscope. The lens system of the microscope is operated in a condition of defocus so that predictable alternate concentric regions of high and low electron density exist in the cone of illumination. Two phase detectors are placed beneath the object inside the cone of illumination, with the first detector having the form of a zone plate, each of its rings covering alternate regions of either higher or lower electron density. The second detector is so configured that it covers the regions of electron density not covered by the first detector. Each detector measures the number of electrons incident thereon and the signal developed by the first detector is subtracted from the signal developed by the record detector to provide a phase contrast signal. (auth)

  7. Electron radiography

    DOE Patents [OSTI]

    Merrill, Frank E.; Morris, Christopher

    2005-05-17

    A system capable of performing radiography using a beam of electrons. Diffuser means receive a beam of electrons and diffuse the electrons before they enter first matching quadrupoles where the diffused electrons are focused prior to the diffused electrons entering an object. First imaging quadrupoles receive the focused diffused electrons after the focused diffused electrons have been scattered by the object for focusing the scattered electrons. Collimator means receive the scattered electrons and remove scattered electrons that have scattered to large angles. Second imaging quadrupoles receive the collimated scattered electrons and refocus the collimated scattered electrons and map the focused collimated scattered electrons to transverse locations on an image plane representative of the electrons' positions in the object.

  8. Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices...

    Office of Scientific and Technical Information (OSTI)

    Through x-ray absorption near edge spectroscopy and aberration-corrected scanning transmission electron microscopy we show that the Ti cations are displaced off-center in the TiO6 ...

  9. Search for: All records | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    ... It is possible to obtain an EMCD signal with atomic resolution by simply breaking the symmetry of the electron probe phase front using the aberration-corrected optics of a scanning ...

  10. Laser excited confocal microscope fluorescence scanner and method

    DOE Patents [OSTI]

    Mathies, Richard A.; Peck, Konan

    1992-01-01

    A fluorescent scanner for scanning the fluorescence from a fluorescence labeled separated sample on a sample carrier including a confocal microscope for illuminating a predetermined volume of the sample carrier and/or receiving and processing fluorescence emissions from said volume to provide a display of the separated sample.

  11. Laser excited confocal microscope fluorescence scanner and method

    DOE Patents [OSTI]

    Mathies, R.A.; Peck, K.

    1992-02-25

    A fluorescent scanner is designed for scanning the fluorescence from a fluorescence labeled separated sample on a sample carrier. The scanner includes a confocal microscope for illuminating a predetermined volume of the sample carrier and/or receiving and processing fluorescence emissions from the volume to provide a display of the separated sample. 8 figs.

  12. Dynamic microscopic theory of fusion using DC-TDHF

    SciTech Connect (OSTI)

    Umar, A. S.; Oberacker, V. E.; Keser, R.; Maruhn, J. A.; Reinhard, P.-G.

    2012-10-20

    The density-constrained time-dependent Hartree-Fock (DC-TDHF) theory is a fully microscopic approach for calculating heavy-ion interaction potentials and fusion cross sections below and above the fusion barrier. We discuss recent applications of DC-TDHF method to fusion of light and heavy systems.

  13. Neutrinoless double beta decay in the microscopic interacting boson model

    SciTech Connect (OSTI)

    Iachello, F. [Center for Theoretical Physics, Sloane Physics Laboratory Yale University New Haven, CT 06520-8120 (United States)

    2009-11-09

    The results of a calculation of the nuclear matrix elements for neutrinoless double beta decay in the closure approximation in several nuclei within the framework of the microscopic interacting boson model (IBM-2) are presented and compared with those calculated in the shell model (SM) and quasiparticle random phase approximation (QRPA)

  14. Microscopic observations of palladium used for cold fusion

    SciTech Connect (OSTI)

    Matsumoto, T. )

    1991-05-01

    This paper examines the microscopic structures of palladium metals used for cold fusion experiments. Tiny spot defects suggesting cold fusion have been observed in grain boundaries as the Nattoh model predicts. The relationship between these defects and a series of neutron busts and an indirect loop of hydrogen chain reactions are discussed.

  15. Scanning Transmission X-ray Microscope Control Program

    Energy Science and Technology Software Center (OSTI)

    2005-08-05

    User Interface and control software or C++ to run on specifically equipped computer running Windows Operating Systems. Program performs specific control functions required to operate Interferometer controlled scanning transmission X-ray microscopes at ALS beamlines 532 and 11.0.2. Graphical user interface facilitates control, display images and spectra.

  16. Reflection soft X-ray microscope and method

    DOE Patents [OSTI]

    Suckewer, S.; Skinner, C.H.; Rosser, R.

    1993-01-05

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  17. Reflection soft X-ray microscope and method

    DOE Patents [OSTI]

    Suckewer, Szymon; Skinner, Charles H.; Rosser, Roy

    1993-01-01

    A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.

  18. A brightness comparison of thermionic electron sources in a TEM

    SciTech Connect (OSTI)

    Cook, R.E.

    1994-03-01

    In the quest for thermionic electron sources brighter than the standard tungsten filament, manufacturers have given us first LaB{sub 6} and then CeB{sub 6} single crystals. This paper compares these 3 electron sources under typical operating conditions in a Philips EM420T transmission microscope.

  19. Spectro-Microscopic Measurements of Carbonaceous Aerosol Aging in Central California

    SciTech Connect (OSTI)

    Moffet, Ryan C.; Rodel, Tobias; Kelly, Stephen T.; Yu, Xiao-Ying; Carroll, Gregory; Fast, Jerome D.; Zaveri, Rahul A.; Laskin, Alexander; Gilles, Mary K.

    2013-10-29

    Carbonaceous aerosols are responsible for large uncertainties in climate models, degraded visibility, and adverse health effects. The Carbonaceous Aerosols and Radiative Effects Study (CARES) was designed to study carbonaceous aerosols in the natural environment of Central Valley, California, and learn more about their atmospheric formation and aging. This paper presents results from spectro-microscopic measurements of carbonaceous particles collected during CARES at the time of pollution accumulation event (June 27-29, 2010), when in situ measurements indicated an increase in the organic carbon content of aerosols as the Sacramento urban plume aged. Computer controlled scanning electron microscopy coupled with an energy dispersive X-ray detector (CCSEM/EDX) and scanning transmission X-ray microscopy coupled with near edge X-ray absorption spectroscopy (STXM/NEXAFS) were used to probe the chemical composition and morphology of individual particles. It was found that the mass of organic carbon on individual particles increased through condensation of secondary organic aerosol. STXM/NEXAFS indicated that the number fraction of homogenous organic particles lacking inorganic inclusions (greater than ~50 nm diameter) increased with plume age as did the organic mass per particle. Comparison of the CARES spectro-microscopic data set with a similar dataset obtained in Mexico City during the MILAGRO campaign showed that individual particles in Mexico City contained twice as much carbon as those sampled during CARES. The number fraction of soot particles at the Mexico City urban site (30%) was larger than at the CARES urban site (10%) and the most aged samples from CARES contained less carbon-carbon double bonds. Differences between carbonaceous particles in Mexico City and California result from different sources, photochemical conditions, gas phase reactants, and secondary organic aerosol precursors. The detailed results provided by these spectro-microscopic measurements

  20. Electron Transfer

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    3 Pierre Kennepohl1,2 and Edward Solomon1* 1Department of Chemistry, Stanford University, Stanford, CA 94305 Electron transfer, or the act of moving an electron from one place to another, is amongst the simplest of chemical processes, yet certainly one of the most critical. The process of efficiently and controllably moving electrons around is one of the primary regulation mechanisms in biology. Without stringent control of electrons in living organisms, life could simply not exist. For example,

  1. Low vibration high numerical aperture automated variable temperature Raman microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Tian, Y.; Reijnders, A. A.; Osterhoudt, G. B.; Valmianski, I.; Ramirez, J. G.; Urban, C.; Zhong, R.; Schneeloch, J.; Gu, G.; Henslee, I.; et al

    2016-04-05

    Raman micro-spectroscopy is well suited for studying a variety of properties and has been applied to wide- ranging areas. Combined with tuneable temperature, Raman spectra can offer even more insights into the properties of materials. However, previous designs of variable temperature Raman microscopes have made it extremely challenging to measure samples with low signal levels due to thermal and positional instability as well as low collection efficiencies. Thus, contemporary Raman microscope has found limited applicability to probing the subtle physics involved in phase transitions and hysteresis. This paper describes a new design of a closed-cycle, Raman microscope with full polarizationmore » rotation. High collection efficiency, thermal and mechanical stability are ensured by both deliberate optical, cryogenic, and mechanical design. Measurements on two samples, Bi2Se3 and V2O3, which are known as challenging due to low thermal conductivities, low signal levels and/or hysteretic effects, are measured with previously undemonstrated temperature resolution.« less

  2. Ion-induced electron emission microscopy

    DOE Patents [OSTI]

    Doyle, Barney L.; Vizkelethy, Gyorgy; Weller, Robert A.

    2001-01-01

    An ion beam analysis system that creates multidimensional maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a sample by projection imaging of the secondary electrons emitted at that point with a signal from a detector that measures the interaction of that ion within the sample. The emitted secondary electrons are collected in a strong electric field perpendicular to the sample surface and (optionally) projected and refocused by the electron lenses found in a photon emission electron microscope, amplified by microchannel plates and then their exact position is sensed by a very sensitive X Y position detector. Position signals from this secondary electron detector are then correlated in time with nuclear, atomic or electrical effects, including the malfunction of digital circuits, detected within the sample that were caused by the individual ion that created these secondary electrons in the fit place.

  3. Integrated Dynamic Electron Solutions, Inc. | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Integrated Dynamic Electron Solutions, Inc. America's Next Top Energy Innovator Challenge 333 likes Integrated Dynamic Electron Solutions, Inc. Lawrence Livermore National Laboratory Dynamic Transmission Electron Microscopes DTEM reveal unprecedented details of the mechanisms underlying a host of nanoscale systems that are at the core of our current and future energy economy. A vast and growing number of materials utilized in the energy sector rely on nanostructured materials and their unique

  4. The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions

    SciTech Connect (OSTI)

    Cooper, David; Twitchett-Harrison, Alison C.; Midgley, Paul A.; Dunin-Borkowski, Rafal E.

    2007-05-01

    Electron beam irradiation is shown to significantly influence phase images recorded from focused ion beam milled GaAs p-n junction specimens examined using off-axis electron holography in the transmission electron microscope. Our results show that the use of improved electrical connections to the specimen overcomes this problem, and may allow the correct built in potential across the junction to be recovered.

  5. Consumer Electronics

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    & Events Expand News & Events Skip navigation links Residential Residential Lighting Energy Star Appliances Consumer Electronics Heat Pump Water Heaters Electric Storage Water...

  6. Near-Field Magneto-Optical Microscope (Patent) | SciTech Connect

    Office of Scientific and Technical Information (OSTI)

    Publication: United States Language: English Subject: 47 OTHER INSTRUMENTATION; FIBER OPTICS; MAGNETIC FIELDS; MICROSCOPES; POLARIZATION; RESOLUTION; DESIGN; OPERATION Word Cloud...

  7. Manipulation of subsurface carbon nanoparticles in Bi?Sr?CaCu?O8+? using a scanning tunneling microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Stollenwerk, A. J.; Gu, G.; Hurley, N.; Beck, B.; Spurgeon, K.; Kidd, T. E.

    2015-03-01

    We present evidence that subsurface carbon nanoparticles in Bi?Sr?CaCu?O8+? can be manipulated with nanometer precision using a scanning tunneling microscope. High resolution images indicate that most of the carbon particles remain subsurface after transport observable as a local increase in height as the particle pushes up on the surface. Tunneling spectra in the vicinity of these protrusions exhibit semiconducting characteristics with a band gap of approximately 1.8 eV, indicating that the incorporation of carbon locally alters the electronic properties near the surface.

  8. Microscopic analysis of order parameters in nuclear quantum phase transitions

    SciTech Connect (OSTI)

    Li, Z. P.; Niksic, T.; Vretenar, D.; Meng, J.

    2009-12-15

    Microscopic signatures of nuclear ground-state shape phase transitions in Nd isotopes are studied using excitation spectra and collective wave functions obtained by diagonalization of a five-dimensional Hamiltonian for quadrupole vibrational and rotational degrees of freedom, with parameters determined by constrained self-consistent relativistic mean-field calculations for triaxial shapes. As a function of the physical control parameter, the number of nucleons, energy gaps between the ground state and the excited vibrational states with zero angular momentum, isomer shifts, and monopole transition strengths exhibit sharp discontinuities at neutron number N=90, which is characteristic of a first-order quantum phase transition.

  9. Propagation of nonlinearly generated harmonic spin waves in microscopic stripes

    SciTech Connect (OSTI)

    Rousseau, O.; Yamada, M.; Miura, K.; Ogawa, S.; Otani, Y.

    2014-02-07

    We report on the experimental study of the propagation of nonlinearly generated harmonic spin waves in microscopic CoFeB stripes. Using an all electrical technique with coplanar waveguides, we find that two kinds of spin waves can be generated by nonlinear frequency multiplication. One has a non-uniform spatial geometry and thus requires appropriate detector geometry to be identified. The other corresponds to the resonant fundamental propagative spin waves and can be efficiently excited by double- or triple-frequency harmonics with any geometry. Nonlinear excited spin waves are particularly efficient in providing an electrical signal arising from spin wave propagation.

  10. Nature's Microscopic Masonry: Sucking in toxins, spitting out products

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Nature's Microscopic Masonry: Sucking in toxins, spitting out products Click to share on Facebook (Opens in new window) Click to share on Twitter (Opens in new window) Click to share on Reddit (Opens in new window) Click to share on Pinterest (Opens in new window) Scientists have for the first time viewed how bacterial proteins self-assemble into thin sheets and begin to form the walls of the outer shell for nano-sized polyhedral compartments that function as specialized factories. This research

  11. High Temperature Materials Laboratory Fourteenth Annual Report: October 2000 through September 2001

    SciTech Connect (OSTI)

    Pasto, A.E.

    2002-05-16

    The HTML User Program continued to work with industrial, academic, and governmental users this year, accepting 92 new projects and developing 48 new user agreements. Table 1 presents the breakdown of these statistics. Figure 1 depicts the continued growth in user agreements and user projects. You will note that the total number of HTML proposals has now exceeded 1000. Also, the large number of new agreements bodes well for the future. At the end of the report, we present a list of proposals to the HTML and a list of agreements between HTML and universities and industries, broken down by state. Program highlights this year included several outstanding user projects (some of which are highlighted in later sections), the annual meeting of the HTML Programs Senior Advisory Committee, and approval by ORNL for the construction of a building to house our new aberration-corrected electron microscope (ACEM) and several other sensitive electron and optical instruments.

  12. Microscopy with slow electrons: from LEEM to XPEEM

    ScienceCinema (OSTI)

    Bauer, Ernst [Arizona State University, Phoenix, Arizona, United States

    2010-01-08

    The short penetration and escape depth of electrons with energies below 1 keV make them ideally suited for the study of surfaces and ultrathin films. The combination of the low energy electrons and the high lateral resolution of a microscope produces a powerful method for the characterization of nanostructures on bulk samples, in particular if the microscope is equipped with an imaging energy filter and connected to a synchrotron radiation source. Comprehensive characterization by imaging, diffraction, and spectroscope of the structural, chemical, and magnetic properties is then possible. The Talk will describe the various imaging techniques in using reflected and emitted electrons in low-energy electron microscopy (LEEM) and x-ray photoemission electron microscopy (XPEEM), with an emphasis on magnetic materials with spin-polarized LEEM and x-ray magnetic circular dichroism PEEM. The talk with end with an outlook on future possibilities.

  13. Microscopic Evaluation of Contaminants in Ultra-High Purity Copper...

    Office of Scientific and Technical Information (OSTI)

    methods including scanning electron microscopy (SEM), laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), and secondary ionization mass spectrometry (SIMS). ...

  14. Identification of Fragile Microscopic Structures during Mineral Transformations in Wet Supercritical CO2

    SciTech Connect (OSTI)

    Arey, Bruce W.; Kovarik, Libor; Qafoku, Odeta; Wang, Zheming; Hess, Nancy J.; Felmy, Andrew R.

    2013-04-01

    In this study we examine the nature of highly fragile reaction products that form in low water content super critical carbon dioxide (scCO2) using a combination of scanning electron microscopy/focus ion beam (SEM/FIB), confocal Raman spectroscopy, helium ion microscopy (HeIM), and transmission electron microscopy (TEM). HeIM images show these precipitates to be fragile rosettes that can readily decompose even under slight heating from an electron beam. Using the TEM revealed details on the interfacial structure between the newly formed surface precipitates and the underlying initial solid phases. The detailed microscopic analysis revealed that the growth of the precipitates either followed a tip growth mechanism with precipitates forming directly on the forsterite surface if the initial solid was non-porous (natural forsterite) or growth from the surface of the precipitates where fluid was conducted through the porous (nanoforsterite) agglomerates to the growth center. The mechanism of formation of the hydrated/hydroxylated magnesium carbonate compound (HHMC) phases offers insight into the possible mechanisms of carbonate mineral formation from scCO2 solutions which has recently received a great deal of attention as the result of the potential for CO2 to act as an atmospheric greenhouse gas and impact overall global warming. The techniques used here to examine these fragile structures an also be used to examine a wide range of fragile material surfaces. SEM and FIB technologies have now been brought together in a single instrument, which represents a powerful combination for the studies in biological, geological and materials science.

  15. Carbon p electron ferromagnetism in silicon carbide

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Wang, Yutian; Liu, Yu; Wang, Gang; Anwand, Wolfgang; Jenkins, Catherine A.; Arenholz, Elke; Munnik, Frans; Gordan, Ovidiu D.; Salvan, Georgeta; Zahn, Dietrich R. T.; et al

    2015-03-11

    Ferromagnetism can occur in wide-band gap semiconductors as well as in carbon-based materials when specific defects are introduced. It is thus desirable to establish a direct relation between the defects and the resulting ferromagnetism. Here, we contribute to revealing the origin of defect-induced ferromagnetism using SiC as a prototypical example. We show that the long-range ferromagnetic coupling can be attributed to the p electrons of the nearest-neighbor carbon atoms around the VSiVC divacancies. Thus, the ferromagnetism is traced down to its microscopic electronic origin.

  16. Carbon p electron ferromagnetism in silicon carbide

    SciTech Connect (OSTI)

    Wang, Yutian; Liu, Yu; Wang, Gang; Anwand, Wolfgang; Jenkins, Catherine A.; Arenholz, Elke; Munnik, Frans; Gordan, Ovidiu D.; Salvan, Georgeta; Zahn, Dietrich R. T.; Chen, Xiaolong; Gemming, Sibylle; Helm, Manfred; Zhou, Shengqiang

    2015-03-11

    Ferromagnetism can occur in wide-band gap semiconductors as well as in carbon-based materials when specific defects are introduced. It is thus desirable to establish a direct relation between the defects and the resulting ferromagnetism. Here, we contribute to revealing the origin of defect-induced ferromagnetism using SiC as a prototypical example. We show that the long-range ferromagnetic coupling can be attributed to the p electrons of the nearest-neighbor carbon atoms around the VSiVC divacancies. Thus, the ferromagnetism is traced down to its microscopic electronic origin.

  17. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2013-01-22

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  18. Analytical scanning evanescent microwave microscope and control stage

    DOE Patents [OSTI]

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2009-06-23

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  19. A Microscopic Quantal Model for Nuclear Collective Rotation

    SciTech Connect (OSTI)

    Gulshani, P.

    2007-10-26

    A microscopic, quantal model to describe nuclear collective rotation in two dimensions is derived from the many-nucleon Schrodinger equation. The Schrodinger equation is transformed to a body-fixed frame to decompose the Hamiltonian into a sum of intrinsic and rotational components plus a Coriolis-centrifugal coupling term. This Hamiltonian (H) is expressed in terms of space-fixed-frame particle coordinates and momenta by using commutator of H with a rotation angle. A unified-rotational-model type wavefunction is used to obtain an intrinsic Schrodinger equation in terms of angular momentum quantum number and two-body operators. A Hartree-Fock mean-field representation of this equation is then obtained and, by means of a unitary transformation, is reduced to a form resembling that of the conventional semi-classical cranking model when exchange terms and intrinsic spurious collective excitation are ignored.

  20. Scanning optical microscope with long working distance objective

    DOE Patents [OSTI]

    Cloutier, Sylvain G.

    2010-10-19

    A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.

  1. Electron tube

    DOE Patents [OSTI]

    Suyama, Motohiro; Fukasawa, Atsuhito; Arisaka, Katsushi; Wang, Hanguo

    2011-12-20

    An electron tube of the present invention includes: a vacuum vessel including a face plate portion made of synthetic silica and having a surface on which a photoelectric surface is provided, a stem portion arranged facing the photoelectric surface and made of synthetic silica, and a side tube portion having one end connected to the face plate portion and the other end connected to the stem portion and made of synthetic silica; a projection portion arranged in the vacuum vessel, extending from the stem portion toward the photoelectric surface, and made of synthetic silica; and an electron detector arranged on the projection portion, for detecting electrons from the photoelectric surface, and made of silicon.

  2. Electronic Coupling Dependence of Ultrafast Interfacial Electron...

    Office of Scientific and Technical Information (OSTI)

    Electronic Coupling Dependence of Ultrafast Interfacial Electron Transfer on Nanocrystalline Thin Films and Single Crystal Citation Details In-Document Search Title: Electronic ...

  3. Electronic system

    DOE Patents [OSTI]

    Robison, G H; Dickson, J F

    1960-11-15

    An electronic system is designed for indicating the occurrence of a plurality of electrically detectable events within predetermined time intervals. The system comprises separate input means electrically associated with the events under observation an electronic channel associated with each input means, including control means and indicating means; timing means adapted to apply a signal from the input means after a predetermined time to the control means to deactivate each of the channels; and means for resetting the system to its initial condition after the observation of each group of events. (D.L.C.)

  4. ELECTRONIC SYSTEM

    DOE Patents [OSTI]

    Robison, G.H. et al.

    1960-11-15

    An electronic system is described for indicating the occurrence of a plurality of electrically detectable events within predetermined time intervals. It is comprised of separate input means electrically associated with the events under observation: an electronic channel associated with each input means including control means and indicating means; timing means associated with each of the input means and the control means and adapted to derive a signal from the input means and apply it after a predetermined time to the control means to effect deactivation of each of the channels; and means for resetting the system to its initial condition after observation of each group of events.

  5. Understanding glass-forming ability through sluggish crystallization of atomically thin metallic glassy films

    SciTech Connect (OSTI)

    Sun, Y. T.; Cao, C. R.; Huang, K. Q.; Zhao, N. J.; Gu, L. E-mail: dzheng@iphy.ac.cn Zheng, D. N. E-mail: dzheng@iphy.ac.cn Wang, W. H. E-mail: dzheng@iphy.ac.cn

    2014-08-04

    The glass-forming ability (GFA) of an alloy, closely related to its ability to resist crystallization, is a crucial issue in condensed matter physics. So far, the studies on GFA are mostly statistical and empirical guides. Benefiting from the ultrahigh thermal stability of ultrathin metallic glassy film and high resolution spherical aberration-corrected transmission electron microscope, the crystallization of atomically thin ZrCu and its microalloyed ZrCuAl glasses with markedly different GFA was investigated at the atomic scale. We find the Zr diffusivity estimated from the density of nuclei is dramatically decreased by adding of Al, which is the major reason for the much better GFA of the ZrCuAl metallic glass.

  6. Nonlocal microscopic theory of quantum friction between parallel metallic slabs

    SciTech Connect (OSTI)

    Despoja, Vito

    2011-05-15

    We present a new derivation of the friction force between two metallic slabs moving with constant relative parallel velocity, based on T=0 quantum-field theory formalism. By including a fully nonlocal description of dynamically screened electron fluctuations in the slab, and avoiding the usual matching-condition procedure, we generalize previous expressions for the friction force, to which our results reduce in the local limit. Analyzing the friction force calculated in the two local models and in the nonlocal theory, we show that for physically relevant velocities local theories using the plasmon and Drude models of dielectric response are inappropriate to describe friction, which is due to excitation of low-energy electron-hole pairs, which are properly included in nonlocal theory. We also show that inclusion of dissipation in the nonlocal electronic response has negligible influence on friction.

  7. THE NONLINEAR AND NONLOCAL LINK BETWEEN MACROSCOPIC ALFVNIC AND MICROSCOPIC ELECTROSTATIC SCALES IN THE SOLAR WIND

    SciTech Connect (OSTI)

    Valentini, F.; Vecchio, A.; Donato, S.; Carbone, V.; Veltri, P.; Briand, C.; Bougeret, J.

    2014-06-10

    The local heating of the solar-wind gas during its expansion represents one of the most intriguing problems in space plasma physics and is at present the subject of a relevant scientific effort. The possible mechanisms that could account for local heat production in the interplanetary medium are most likely related to the turbulent character of the solar-wind plasma. Nowadays, many observational and numerical analyses are devoted to the identification of fluctuation channels along which energy is carried from large to short wavelengths during the development of the turbulent cascade; these fluctuation channels establish the link between macroscopic and microscopic scales. In this Letter, by means of a quantitative comparison between in situ measurements in the solar wind from the STEREO spacecraft and numerical results from kinetic simulations, we identify an electrostatic channel of fluctuations that develops along the turbulent cascade in a direction parallel to the ambient magnetic field. This channel appears to be efficient in transferring the energy from large Alfvnic to short electrostatic acoustic-like scales up to a range of wavelengths where it can finally be turned into heat, even when the electron to proton temperature ratio is of the order of unity.

  8. Nonlocal microscopic theory of Casimir forces at finite temperature

    SciTech Connect (OSTI)

    Despoja, V.; Marusic, L.

    2011-04-15

    The interaction energy between two metallic slabs in the retarded limit at finite temperature is expressed in terms of surface polariton propagators for separate slabs, avoiding the usual matching procedure, with both diamagnetic and paramagnetic excitations included correctly. This enables appropriate treatment of arbitrary electron density profiles and fully nonlocal electronic response, including both collective and single-particle excitations. The results are verified by performing the nonretarded and long-wavelength (local) limits and showing that they reduce to the previously obtained expressions. Possibilities for practical use of the theory are explored by applying it to calculation of various contributions to the Casimir energy between two silver slabs.

  9. A new ion sensing deep atomic force microscope

    SciTech Connect (OSTI)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  10. Microscopic studies of nonlocal spin dynamics and spin transport (invited)

    SciTech Connect (OSTI)

    Adur, Rohan; Du, Chunhui; Cardellino, Jeremy; Scozzaro, Nicolas; Wolfe, Christopher S.; Wang, Hailong; Herman, Michael; Bhallamudi, Vidya P.; Pelekhov, Denis V.; Yang, Fengyuan; Hammel, P. Chris

    2015-05-07

    Understanding the behavior of spins coupling across interfaces in the study of spin current generation and transport is a fundamental challenge that is important for spintronics applications. The transfer of spin angular momentum from a ferromagnet into an adjacent normal material as a consequence of the precession of the magnetization of the ferromagnet is a process known as spin pumping. We find that, in certain circumstances, the insertion of an intervening normal metal can enhance spin pumping between an excited ferromagnetic magnetization and a normal metal layer as a consequence of improved spin conductance matching. We have studied this using inverse spin Hall effect and enhanced damping measurements. Scanned probe magnetic resonance techniques are a complementary tool in this context offering high resolution magnetic resonance imaging, localized spin excitation, and direct measurement of spin lifetimes or damping. Localized magnetic resonance studies of size-dependent spin dynamics in the absence of lithographic confinement in both ferromagnets and paramagnets reveal the close relationship between spin transport and spin lifetime at microscopic length scales. Finally, detection of ferromagnetic resonance of a ferromagnetic film using the photoluminescence of nitrogen vacancy spins in neighboring nanodiamonds demonstrates long-range spin transport between insulating materials, indicating the complexity and generality of spin transport in diverse, spatially separated, material systems.

  11. Use of single scatter electron monte carlo transport for medical radiation sciences

    DOE Patents [OSTI]

    Svatos, Michelle M.

    2001-01-01

    The single scatter Monte Carlo code CREEP models precise microscopic interactions of electrons with matter to enhance physical understanding of radiation sciences. It is designed to simulate electrons in any medium, including materials important for biological studies. It simulates each interaction individually by sampling from a library which contains accurate information over a broad range of energies.

  12. ELECTRONIC MULTIPLIER

    DOE Patents [OSTI]

    Collier, D.M.; Meeks, L.A.; Palmer, J.P.

    1961-01-31

    S>An electronic multiplier is described for use in analog computers. Two electrical input signals are received; one controls the slope of a saw-tooth voltage wave while the other controls the time duration of the wave. A condenser and diode clamps are provided to sustain the crest voltage reached by the wave, and for storing that voltage to provide an output signal which is a steady d-c voltage.

  13. Electron Bernstein

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Bernstein wave emission from an overdense reversed field pinch plasma P. K. Chattopadhyay, J. K. Anderson, T. M. Biewer, D. Craig, and C. B. Forest a) Department of Physics, University of Wisconsin, Madison, Wisconsin 53706 R. W. Harvey CompX, Del Mar, California 92014 A. P. Smirnov Moscow State University, Moscow, Russia ͑Received 11 October 2001; accepted 20 November 2001͒ Blackbody levels of emission in the electron cyclotron range of frequencies have been observed from an overdense (␻ pe

  14. ELECTRON GUN

    DOE Patents [OSTI]

    Christofilos, N.C.; Ehlers, K.W.

    1960-04-01

    A pulsed electron gun capable of delivering pulses at voltages of the order of 1 mv and currents of the order of 100 amperes is described. The principal novelty resides in a transformer construction which is disposed in the same vacuum housing as the electron source and accelerating electrode structure of the gun to supply the accelerating potential thereto. The transformer is provided by a plurality of magnetic cores disposed in circumferentially spaced relation and having a plurality of primary windings each inductively coupled to a different one of the cores, and a helical secondary winding which is disposed coaxially of the cores and passes therethrough in circumferential succession. Additional novelty resides in the disposition of the electron source cathode filament input leads interiorly of the transformer secondary winding which is hollow, as well as in the employment of a half-wave filament supply which is synchronously operated with the transformer supply such that the transformer is pulsed during the zero current portions of the half-wave cycle.

  15. Multiwalled carbon nanotubes and dispersed nanodiamond novel hybrids: Microscopic structure evolution, physical properties, and radiation resilience

    SciTech Connect (OSTI)

    Gupta, S.; Farmer, J.

    2011-01-01

    We report the structure and physical properties of novel hybrids of multiwalled carbon nanotubes (MWCNTs) and ultradispersed diamond (UDD) forming nanocomposite ensemble that were subjected to 50, 100, and 10{sup 3} kGy gamma ray doses and characterized using various analytical tools to investigate hierarchical defects evolution. This work is prompted by recent work on single-walled CNTs and UDD ensemble [Gupta et al., J. Appl. Phys. 107, 104308 (2010)] where radiation-induced microscopic defects seem to be stabilized by UDD. The present experiments show similar effects where these hybrids display only a minimal structural modification under the maximum dose. Quantitative analyses of multiwavelength Raman spectra revealed lattice defects induced by irradiation assessed through the variation in prominent D, G, and 2D bands. A minimal change in the position of D, G, and 2D bands and a marginal increase in intensity of the defect-induced double resonant Raman scattered D and 2D bands are some of the implications suggesting the radiation coupling. The in-plane correlation length (L{sub a}) was also determined following Tunistra-Koenig relation from the ratio of D to G band (I{sub D}/I{sub G}) besides microscopic stress. However, we also suggest the following taking into account of intrinsic defects of the constituents: (a) charge transfer arising at the interface due to the difference in electronegativity of MWCNT C sp{sup 2} and UDD core (C sp{sup 3}) leading to phonon and electron energy renormalization; (b) misorientation of C sp{sup 2} at the interface of MWCNT and UDD shell (C sp{sup 2}) resulting in structural disorder; (c) softening or violation of the q{approx}0 selection rule leading to D band broadening and a minimal change in G band intensity; and (d) normalized intensity of D and G bands with 2D band help to distinguish defect-induced double resonance phenomena. The MWCNT when combined with nanodiamond showed a slight decrease in their conductance further

  16. A metrological large range atomic force microscope with improved performance

    SciTech Connect (OSTI)

    Dai, Gaoliang; Wolff, Helmut; Pohlenz, Frank; Danzebrink, Hans-Ulrich

    2009-04-15

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument.

  17. Free vibrations of U-shaped atomic force microscope probes

    SciTech Connect (OSTI)

    Rezaei, E.; Turner, J. A.

    2014-05-07

    Contact resonance atomic force microscope (AFM) methods have been used to quantify the elastic and viscoelastic properties of a variety of materials such as polymers, ceramics, biological materials, and metals with spatial resolution on the order of tens of nanometers. This approach involves measurement of the resonant frequencies of the AFM probe both for the free case and the case for which the tip is in contact with a sample. Vibration models of the probe and tip-sample contact models are then used to determine the sample properties from the frequency behavior and to create images of the sample properties. This work has been primarily focused on rectangular, single-beam probes for which the vibration models are relatively simple. Recently, U-shaped AFM probes have been developed to allow local heating of samples and the resonances of these probes are much more complex. In this article, a simplified analytical model of these U-shaped probes is described. This three beam model includes two beams clamped at one end and connected with a perpendicular cross beam at the other end. The beams are assumed only to bend in flexure and twist but their coupling allows a wide range of possible dynamic behavior. Results are presented for the first ten modes and the mode shapes are shown to have complex coupling between the flexure and twisting of the beams, particularly for the higher modes. All resonant frequency results are in good agreement with finite element results for the three probe designs and two values of thickness considered (all wavenumbers are within 3.0%). This work is anticipated to allow U-shaped probes to be used eventually for quantitative measurements of sample material properties during heating using a contact resonance approach.

  18. Macro- and microscopic properties of strontium doped indium oxide

    SciTech Connect (OSTI)

    Nikolaenko, Y. M.; Kuzovlev, Y. E.; Medvedev, Y. V.; Mezin, N. I.; Fasel, C.; Gurlo, A.; Schlicker, L.; Bayer, T. J. M.; Genenko, Y. A.

    2014-07-28

    Solid state synthesis and physical mechanisms of electrical conductivity variation in polycrystalline, strontium doped indium oxide In{sub 2}O{sub 3}:(SrO){sub x} were investigated for materials with different doping levels at different temperatures (T?=?20300?C) and ambient atmosphere content including humidity and low pressure. Gas sensing ability of these compounds as well as the sample resistance appeared to increase by 4 and 8 orders of the magnitude, respectively, with the doping level increase from zero up to x?=?10%. The conductance variation due to doping is explained by two mechanisms: acceptor-like electrical activity of Sr as a point defect and appearance of an additional phase of SrIn{sub 2}O{sub 4}. An unusual property of high level (x?=?10%) doped samples is a possibility of extraordinarily large and fast oxygen exchange with ambient atmosphere at not very high temperatures (100200?C). This peculiarity is explained by friable structure of crystallite surface. Friable structure provides relatively fast transition of samples from high to low resistive state at the expense of high conductance of the near surface layer of the grains. Microscopic study of the electro-diffusion process at the surface of oxygen deficient samples allowed estimation of the diffusion coefficient of oxygen vacancies in the friable surface layer at room temperature as 3??10{sup ?13}?cm{sup 2}/s, which is by one order of the magnitude smaller than that known for amorphous indium oxide films.

  19. Growth of microscopic cones on titanium cathodes of sputter-ion pumps driven by sorption of large argon quantities

    SciTech Connect (OSTI)

    Porcelli, Tommaso; Siviero, Fabrizio; Bongiorno, Gero A.; Michelato, Paolo; Pagani, Carlo

    2015-09-15

    Microscopic cones have been observed on titanium cathodes of sputter-ion pumps (SIPs) after pump operation. The cones were studied by means of scanning electron microscopy and energy dispersive x-ray analysis. Size and morphology of these cones are clearly correlated with the nature and the relative amount of each gas species pumped by each SIP during its working life. In particular, their growth was found to be fed by sputtering mechanisms, mostly during Ar pumping, and to be driven by the electromagnetic field applied to the Penning cells of each SIP. Experimental findings suggest that the formation and extent of such conic structures on cathode surfaces might play a leading role in the onset of phenomena typically related to the functioning of SIPs, e.g., the so-called argon instability.

  20. Patterned electrochemical deposition of copper using an electron beam

    SciTech Connect (OSTI)

    Heijer, Mark den; Shao, Ingrid; Reuter, Mark C.; Ross, Frances M.; Radisic, Alex

    2014-02-01

    We describe a technique for patterning clusters of metal using electrochemical deposition. By operating an electrochemical cell in the transmission electron microscope, we deposit Cu on Au under potentiostatic conditions. For acidified copper sulphate electrolytes, nucleation occurs uniformly over the electrode. However, when chloride ions are added there is a range of applied potentials over which nucleation occurs only in areas irradiated by the electron beam. By scanning the beam we control nucleation to form patterns of deposited copper. We discuss the mechanism for this effect in terms of electron beam-induced reactions with copper chloride, and consider possible applications.

  1. Microscopic theory of thermoelectric properties of silicon nanowires

    SciTech Connect (OSTI)

    Vo, T; Williamson, A; Lordi, V; Galli, G

    2007-06-14

    We present predictions of the thermoelectric figure of merit (ZT) of Si nanowires, as obtained using Boltzman transport equation and ab-initio electronic structure calculations. We find that ZT is strongly dependent on the nanowire growth direction and surface reconstruction and we discuss general rules to select silicon based nanostructures with combined n-type and p-type optimal ZT. In particular, our calculations indicate that 1 nm wires grown in the [001] and [011] directions can attain ZT values which are about twice as high as those of ordinary thermoelectric materials.

  2. Development and applications of the positron microscope. Progress report, October 1988--September 1991

    SciTech Connect (OSTI)

    Not Available

    1991-12-31

    Progress on the positron microscope during the past year has been steady, and we currently project that initial microscope images can be collected during mid to late summer of 1992. Work during the year has mainly been divided among four areas of effort: hardware construction; power supply and control system development; radioactive source fabrication; and planning of initial experimental projects. Details of progress in these areas will be given below. An initial optical design of the microscope was completed during 1990, but during the past year, significant improvements have been made to this design, and several limiting cases of microscope performance have been evaluated. The results of these evaluations have been extremely encouraging, giving us strong indications that the optical performance of the microscope will be better than originally anticipated. In particular, we should be able to explore ultimate performance capabilities of positron microscopy using our currently planned optical system, with improvements only in the image detector system, and the positron-source/moderator configuration. We should be able to study imaging reemission microscopy with resolutions approaching 10 {Angstrom} and be able to produce beam spots for rastered microscope work with diameters below the 1000 {Angstrom} diffusion limit. Because of these exciting new possibilities, we have decided to upgrade several microscope subsystems to levels consistent with ultimate performance earlier in our construction schedule than we had previously intended. In particular, alignment facilities in the optical system, vibration isolation, and power supply and control system flexibility have all been upgraded in their design over the past year.

  3. Electronic Coupling Dependence of Ultrafast Interfacial Electron...

    Office of Scientific and Technical Information (OSTI)

    Electron Transfer on Nanocrystalline Thin Films and Single Crystal Lian, Tianquan 14 SOLAR ENERGY The long-term goal of the proposed research is to understand electron transfer...

  4. Demonstration of achromatic cold-neutron microscope utilizing axisymmetric focusing mirrors

    SciTech Connect (OSTI)

    Liu, D.; Khaykovich, B. [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States)] [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States); Hussey, D.; Jacobson, D.; Arif, M. [Physical Measurement Laboratory, NIST, Gaithersburg, Maryland 20899-8461 (United States)] [Physical Measurement Laboratory, NIST, Gaithersburg, Maryland 20899-8461 (United States); Gubarev, M. V.; Ramsey, B. D. [Marshall Space Flight Center, NASA, VP62, Huntsville, Alabama 35812 (United States)] [Marshall Space Flight Center, NASA, VP62, Huntsville, Alabama 35812 (United States); Moncton, D. E. [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States) [Nuclear Reactor Laboratory, Massachusetts Institute of Technology, 138 Albany St., Cambridge, Massachusetts 02139 (United States); Department of Physics, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, Massachusetts 02139 (United States)

    2013-05-06

    An achromatic cold-neutron microscope with magnification 4 is demonstrated. The image-forming optics is composed of nested coaxial mirrors of full figures of revolution, so-called Wolter optics. The spatial resolution, field of view, and depth of focus are measured and found consistent with ray-tracing simulations. Methods of increasing the resolution and magnification are discussed, as well as the scientific case for the neutron microscope. In contrast to traditional pinhole-camera neutron imaging, the resolution of the microscope is determined by the mirrors rather than by the collimation of the beam, leading to possible dramatic improvements in the signal rate and resolution.

  5. Manipulation of subsurface carbon nanoparticles in Bi2Sr2CaCu2O8+? using a scanning tunneling microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Stollenwerk, A. J.; Hurley, N.; Beck, B.; Spurgeon, K.; Kidd, T. E.; Gu, G.

    2015-03-19

    In this study, we present evidence that subsurface carbon nanoparticles in Bi?Sr?CaCu?O8+? can be manipulated with nanometer precision using a scanning tunneling microscope. High resolution images indicate that most of the carbon particles remain subsurface after transport observable as a local increase in height as the particle pushes up on the surface. Tunneling spectra in the vicinity of these protrusions exhibit semiconducting characteristics with a band gap of approximately 1.8 eV, indicating that the incorporation of carbon locally alters the electronic properties near the surface.

  6. Manipulation of subsurface carbon nanoparticles in Bi2Sr2CaCu2O8+δ using a scanning tunneling microscope

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Stollenwerk, A. J.; Hurley, N.; Beck, B.; Spurgeon, K.; Kidd, T. E.; Gu, G.

    2015-03-19

    In this study, we present evidence that subsurface carbon nanoparticles in Bi₂Sr₂CaCu₂O8+δ can be manipulated with nanometer precision using a scanning tunneling microscope. High resolution images indicate that most of the carbon particles remain subsurface after transport observable as a local increase in height as the particle pushes up on the surface. Tunneling spectra in the vicinity of these protrusions exhibit semiconducting characteristics with a band gap of approximately 1.8 eV, indicating that the incorporation of carbon locally alters the electronic properties near the surface.

  7. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Wild 2 Viewed by ALS Microscopes Print NASA's 200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81PWild...

  8. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81PWild 2 Viewed by ALS Microscopes Print NASA's 200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the...

  9. Comet 81P/Wild 2 Under a Microscope (Journal Article) | SciTech...

    Office of Scientific and Technical Information (OSTI)

    Journal Article: Comet 81PWild 2 Under a Microscope Citation Details In-Document Search Title: Comet ... Publication Date: 2007-01-16 OSTI Identifier: 897746 Report Number(s): ...

  10. NNSA & DOE Employees Use Tiny Smartphone Microscopes to Teach STEM |

    National Nuclear Security Administration (NNSA)

    National Nuclear Security Administration | (NNSA) & DOE Employees Use Tiny Smartphone Microscopes to Teach STEM Wednesday, January 27, 2016 - 12:31pm NNSA Blog Users discovered items the device could magnify, such as yarn, human hair, and flower petals. Employees lunching on Friday, January 15, in the Department of Energy headquarters cafeteria received smartphone microscopes and a mission: Engage five students over Martin Luther King Jr. Day of Service in a STEM conversation using the

  11. Fragment Yields Calculated in a Time-Dependent Microscopic Theory of

    Office of Scientific and Technical Information (OSTI)

    Fission (Technical Report) | SciTech Connect Fragment Yields Calculated in a Time-Dependent Microscopic Theory of Fission Citation Details In-Document Search Title: Fragment Yields Calculated in a Time-Dependent Microscopic Theory of Fission Authors: Younes, W ; Gogny, D Publication Date: 2012-09-28 OSTI Identifier: 1053671 Report Number(s): LLNL-TR-586678 DOE Contract Number: W-7405-ENG-48 Resource Type: Technical Report Research Org: Lawrence Livermore National Laboratory (LLNL),

  12. Geek-Up[6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes |

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Department of Energy 6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes Geek-Up[6.3.2011]: Inked PV, Diagnostic Tools and Tough Microscopes June 3, 2011 - 2:04pm Addthis Novartis Diagnostics scientist Cleo Salisbury and Biological Nanostructures Facility director Ron Zuckermann discuss their collaboration to discover new therapies for Alzheimer's. Niketa Kumar Niketa Kumar Public Affairs Specialist, Office of Public Affairs What does this mean for me? Researchers have developed new

  13. Electron-microscopic study on the structure of indirect flight muscles in pupae of Drosophila melanogaster muscle mutant

    SciTech Connect (OSTI)

    Generalova, M.V.; Kryukova, M.E.; Myasnyankina, E.N.

    1994-11-01

    We have analyzed the ultrastructure of indirect flight muscles in Drosophila pupae heterozygous for the mutation Mhc{sup M66}, which is a cold-sensitive allele of locus Mhc (Myosin heavy chain). We found that initially the differentiation of the muscle fiber in the mutant does not differ from that of the wild type. The first visible changes (loss of individual myosin protofibrils) appear in myofibrils reaching a certain size. Disintegration of contractile machinery progresses with the increase in the size of myofibrils. We discuss possible mechanisms of triggering and progression of these destructive processes during ontogenesis. 26 refs., 2 figs.

  14. Micromechanical and in situ shear testing of Al–SiC nanolaminate composites in a transmission electron microscope (TEM)

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Mayer, Carl; Li, Nan; Mara, Nathan Allan; Chawla, Nikhilesh

    2014-11-07

    Nanolaminate composites show promise as high strength and toughness materials. Still, due to the limited volume of these materials, micron scale mechanical testing methods must be used to determine the properties of these films. To this end, a novel approach combining a double notch shear testing geometry and compression with a flat punch in a nanoindenter was developed to determine the mechanical properties of these films under shear loading. To further elucidate the failure mechanisms under shear loading, in situ TEM experiments were performed using a double notch geometry cut into the TEM foil. Aluminum layer thicknesses of 50nm andmore » 100nm were used to show the effect of constraint on the deformation. Higher shear strength was observed in the 50 nm sample (690±54 MPa) compared to the 100 nm sample (423±28.7 MPa). Additionally, failure occurred along the Al-SiC interface in the 50 nm sample as opposed to failure within the Al layer in the 100 nm sample.« less

  15. The Nature of the Distinctive Microscopic Features in R5(SixGe1-x)4 Magnetic Refrigeration Materials

    SciTech Connect (OSTI)

    Ozan Ugurlu

    2006-05-01

    Magnetic refrigeration is a promising technology that offers a potential for high energy efficiency. The giant magnetocaloric effect of the R{sub 5}(Si{sub x}, Ge{sub 1-x}){sub 4} alloys (where R=rare-earth and O {le} x {le} 1), which was discovered in 1997, make them perfect candidates for magnetic refrigeration applications. In this study the microstructures of Gd{sub 5}(Si{sub x}Ge{sub 1-x}){sub 4} alloys have been characterized using electron microscopy techniques, with the focus being on distinctive linear features first examined in 1999. These linear features have been observed in R{sub 5}(Si{sub x}, Ge{sub 1-x}){sub 4} alloys prepared from different rare-earths (Gd, Tb, Dy and Er) with different crystal structures (Gd{sub 5}Si{sub 4}-type orthorhombic, monoclinic and Gd{sub 5}Ge{sub 4}-type orthorhombic). Systematic scanning electron microscope studies revealed that these linear features are actually thin-plates, which grow along specific directions in the matrix material. The crystal structure of the thin-plates has been determined as hexagonal with lattice parameters a=b=8.53 {angstrom} and c=6.40 {angstrom} using selected area diffraction (SAD). Energy dispersive spectroscopy analysis, carried out in both scanning and transmission electron microscopes, showed that the features have a composition approximating to R{sub 5}(Si{sub x},Ge{sub 1-x}){sub 3}.phase. Orientation relationship between the matrix and the thin-plates has been calculated as [- 1010](1-211){sub p}//[010](10-2){sub m}. The growth direction of the thin plates are calculated as (22 0 19) and (-22 0 19) by applying the Ag approach of Zhang and Purdy to the SAD patterns of this system. High Resolution TEM images of the Gd{sub 5}Ge{sub 4} were used to study the crystallographic relationship. A terrace-ledge structure was observed at the interface and a 7{sup o} rotation of the reciprocal lattices with respect to each other, consistent with the determined orientation relationship, was noted

  16. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    SciTech Connect (OSTI)

    Karc?, zgr; Dede, Mnir

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ~12 fm/?Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  17. In-line three-dimensional holography of nanocrystalline objects at atomic resolution

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Chen, F. -R.; Van Dyck, D.; Kisielowski, C.

    2016-02-18

    We report that resolution and sensitivity of the latest generation aberration-corrected transmission electron microscopes allow the vast majority of single atoms to be imaged with sub-Ångstrom resolution and their locations determined in an image plane with a precision that exceeds the 1.9-pm wavelength of 300 kV electrons. Such unprecedented performance allows expansion of electron microscopic investigations with atomic resolution into the third dimension. Here we show a general tomographic method to recover the three-dimensional shape of a crystalline particle from high-resolution images of a single projection without the need for sample rotation. The method is compatible with low dose ratemore » electron microscopy, which improves on signal quality, while minimizing electron beam-induced structure modifications even for small particles or surfaces. Lastly, we apply it to germanium, gold and magnesium oxide particles, and achieve a depth resolution of 1–2 Å, which is smaller than inter-atomic distances.« less

  18. Multifractal electronic wave functions in the Anderson model of localization

    SciTech Connect (OSTI)

    Schreiber, M.; Grussbach, H. )

    1992-06-20

    In this paper, investigations of the multifractal properties of electronic wave functions in disordered samples are reviewed. The characteristic mass exponents of the multifractal measure, the generalized dimensions and the singularity spectra are discussed for typical cases. New results for large 3D systems are reported, suggesting that the multifractal properties at the mobility edge which separates localized and extended states are independent of the microscopic details of the model.

  19. Electron beam generation in Tevatron electron lenses

    SciTech Connect (OSTI)

    Kamerdzhiev, V.; Kuznetsov, G.; Shiltsev, V.; Solyak, N.; Tiunov, M.; /Novosibirsk, IYF

    2006-08-01

    New type of high perveance electron guns with convex cathode has been developed. Three guns described in this article are built to provide transverse electron current density distributions needed for Electron Lenses for beam-beam compensation in the Tevatron collider. The current distribution can be controlled either by the gun geometry or by voltage on a special control electrode located near cathode. We present the designs of the guns and report results of beam measurements on the test bench. Because of their high current density and low transverse temperature of electrons, electron guns of this type can be used in electron cooling and beam-beam compensation devices.

  20. Optically pulsed electron accelerator

    DOE Patents [OSTI]

    Fraser, J.S.; Sheffield, R.L.

    1985-05-20

    An optically pulsed electron accelerator can be used as an injector for a free electron laser and comprises a pulsed light source, such as a laser, for providing discrete incident light pulses. A photoemissive electron source emits electron bursts having the same duration as the incident light pulses when impinged upon by same. The photoemissive electron source is located on an inside wall of a radiofrequency-powered accelerator cell which accelerates the electron burst emitted by the photoemissive electron source.

  1. Optically pulsed electron accelerator

    DOE Patents [OSTI]

    Fraser, John S.; Sheffield, Richard L.

    1987-01-01

    An optically pulsed electron accelerator can be used as an injector for a free electron laser and comprises a pulsed light source, such as a laser, for providing discrete incident light pulses. A photoemissive electron source emits electron bursts having the same duration as the incident light pulses when impinged upon by same. The photoemissive electron source is located on an inside wall of a radio frequency powered accelerator cell which accelerates the electron burst emitted by the photoemissive electron source.

  2. Probing Battery Chemistry with Liquid Cell Electron Energy Loss Spectroscopy

    SciTech Connect (OSTI)

    Unocic, Raymond R.; Baggetto, Loic; Veith, Gabriel M.; Aguiar, Jeffery A.; Unocic, Kinga A.; Sacci, Robert L.; Dudney, Nancy J.; More, Karren L.

    2015-11-25

    We demonstrate the ability to apply electron energy loss spectroscopy (EELS) to follow the chemistry and oxidation states of LiMn2O4 and Li4Ti5O12 battery electrodes within a battery solvent. The use and importance of in situ electrochemical cells coupled with a scanning/transmission electron microscope (S/TEM) has expanded and been applied to follow changes in battery chemistry during electrochemical cycling. Furthermore, we discuss experimental parameters that influence measurement sensitivity and provide a framework to apply this important analytical method to future in situ electrochemical studies.

  3. A Community of Electrons

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    plutonium's missing magnetism also provides a groundbreaking insight into the overall nature of matter. November 20, 2015 A Community of Electrons With electronic correlations,...

  4. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in...

  5. Electron Microscopy Center

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Microscopy Center Argonne Home > EMC > EMC Home Electron Microscopy Center Web Site has moved This page has moved to http:www.anl.govcnmgroupelectron-microscopy-cente...

  6. Coherent and intense multibeam generation by the apex of sharp nano-objects: Electron half-circular prism

    SciTech Connect (OSTI)

    Cho, B.; Ishikawa, T.; Oshima, C.

    2007-10-15

    Mutually coherent multiple electron beams (multibeam) were generated from diffraction at the apex of sharp nano-objects, especially carbon nanotubes, in a field emission projection microscope. Simulation using a simple scalar diffraction model showed that the apex of sharp nano-objects played the role of an electron half-circular prism, deflecting an electron beam through a constant angle toward the prism axis. The multibeam diffraction pattern gave a high visibility of {approx}0.8 and high intensity.

  7. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Print Wednesday, 30 May 2007 00:00 NASA's $200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81P/Wild 2. Four ALS beamlines and the researchers using them were among the hundreds of scientists and dozens of experimental techniques in facilities around the world that contributed to the preliminary examination

  8. Detection and measurement of electroreflectance on quantum cascade laser device using Fourier transform infrared microscope

    SciTech Connect (OSTI)

    Enobio, Eli Christopher I.; Ohtani, Keita; Ohno, Yuzo; Ohno, Hideo

    2013-12-02

    We demonstrate the use of a Fourier Transform Infrared microscope system to detect and measure electroreflectance (ER) from mid-infrared quantum cascade laser (QCL) device. To characterize intersubband transition (ISBT) energies in a functioning QCL device, a microscope is used to focus the probe on the QCL cleaved mirror. The measured ER spectra exhibit resonance features associated to ISBTs under applied electric field in agreement with the numerical calculations and comparable to observed photocurrent, and emission peaks. The method demonstrates the potential as a characterization tool for QCL devices.

  9. Electronic Transitions in f-electron Metals at High Pressures...

    Office of Scientific and Technical Information (OSTI)

    Technical Report: Electronic Transitions in f-electron Metals at High Pressures: Citation Details In-Document Search Title: Electronic Transitions in f-electron Metals at High ...

  10. Electron-beam mapping of plasmon resonances in electromagnetically interacting gold nanorods

    SciTech Connect (OSTI)

    N'Gom, Moussa; Li Shuzhou; Schatz, George; Erni, Rolf; Agarwal, Ashish; Kotov, Nicholas; Norris, Theodore B.

    2009-09-15

    Electron energy-loss spectroscopy and energy-filtered transmission electron-microscope imaging are used to characterize the energy distribution of the surface plasmon of isolated and coupled gold nanorods. Local-field enhancement and spectral shift of the plasmon modes are observed for two interacting nanoparticles. The spatial modes measured by energy loss are shown to share qualitative similarities with the electromagnetic field distribution around gold nanorods induced by optical excitation as simulated using the discrete dipole-approximation method.

  11. Ultraviolet and electron irradiation of DC-704 siloxane oil in zinc orthotitanate paint

    SciTech Connect (OSTI)

    Mossman, D.L.; Barsh, M.K.; Greenberg, S.A.

    1982-01-01

    Discrepancies exist between accelerated laboratory simulation and geosynchronous orbit flight data for zinc orthotitanate (ZOT) paint degradation. The effects of ultraviolet and electron irradiation on ZOT contaminated with DC-704 silicone oil are reported. In-situ solar absorptance and emittance changes for contaminated and clean specimens are discussed with reference to post-test surface morphology, determined by scanning electron microscope analysis. Features of the contaminated ZOT degradation kinetics correlate with orbital performance.

  12. Microscopic silicon-based lateral high-aspect-ratio structures for thin film conformality analysis

    SciTech Connect (OSTI)

    Gao, Feng; Arpiainen, Sanna; Puurunen, Riikka L.

    2015-01-15

    Film conformality is one of the major drivers for the interest in atomic layer deposition (ALD) processes. This work presents new silicon-based microscopic lateral high-aspect-ratio (LHAR) test structures for the analysis of the conformality of thin films deposited by ALD and by other chemical vapor deposition means. The microscopic LHAR structures consist of a lateral cavity inside silicon with a roof supported by pillars. The cavity length (e.g., 20–5000 μm) and cavity height (e.g., 200–1000 nm) can be varied, giving aspect ratios of, e.g., 20:1 to 25 000:1. Film conformality can be analyzed with the microscopic LHAR by several means, as demonstrated for the ALD Al{sub 2}O{sub 3} and TiO{sub 2} processes from Me{sub 3}Al/H{sub 2}O and TiCl{sub 4}/H{sub 2}O. The microscopic LHAR test structures introduced in this work expose a new parameter space for thin film conformality investigations expected to prove useful in the development, tuning and modeling of ALD and other chemical vapor deposition processes.

  13. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    DOE Patents [OSTI]

    Fink, Samuel D.; Fondeur, Fernando F.

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  14. Microscopic Description of the Exotic Nuclei Reactions by Using Folding model Potentials

    SciTech Connect (OSTI)

    Ibraheem, Awad A.; Hassanain, M. A.; Mokhtar, S. R.; El-Azab Farid, M.; Zaki, M. A.; Mahmoud, Zakaria M. M.

    2011-10-27

    A microscopic folding approach based upon the effective M3Y nucleon-nucleon interaction and the nuclear matter densities of the interacting nuclei has been carried out to explain recently measured experimental data of the {sup 6}He+{sup 120}Sn elastic scattering reaction at four different laboratory energies near the Coulomb barrier. The corresponding reaction cross sections are also considered.

  15. SU-E-T-544: Microscopic Dose Enhancement of Gold Nanoparticles in Water for Proton Therapy: A Simulation Study

    SciTech Connect (OSTI)

    Newpower, M; Ahmad, S; Chen, Y

    2015-06-15

    Purpose: To quantify the microscopic dose and linear energy transfer (LET) enhancement of gold nanoparticles (GNPs) in water for proton therapy. Methods: The GEANT4 toolkit (version 10) with low energy electromagnetic classes was used to create a series of simulations where three radii (r=5, 20, 100 nm) of gold nanoparticles (GNPs) were irradiated with 5 × 106 80 MeV protons. A cubic detector (10 × 10 × 10 um, divided in 25 × 25 × 25 voxels) were placed in a water phantom where the GNP rests in the center. The size of incident proton beam was set to be same as the GNPs and perpendicularly aiming to the target. Dose deposited to each voxel were recorded to calculate the overall deposited dose and the dose-averaged LET. The emitted secondary electron spectra were also collected in a spherical customized scorer (radius = 150 nm). Results: The average dose from a single GNP in a cubic water phantom was increased by 0.12 %, 1.12% and 2.3% and the mean dose-averaged LET was increased by 5.87% and 27.67% and 0.31% for GNP radius of 5 nm, 20 nm and 100 nm, respectively. Conclusion: The dose enhancement effect from the presence of a single GNP was qualified in a water phantom. A significant increase in the mean dose-averaged LET was found for 20 nm GNP.

  16. Gas mixing system for imaging of nanomaterials under dynamic environments by environmental transmission electron microscopy

    SciTech Connect (OSTI)

    Akatay, M. Cem; Zvinevich, Yury; Ribeiro, Fabio H. E-mail: estach@bnl.gov; Baumann, Philipp; Stach, Eric A. E-mail: estach@bnl.gov

    2014-03-15

    A gas mixing manifold system that is capable of delivering a stable pressure stream of a desired composition of gases into an environmental transmission electron microscope has been developed. The system is designed to provide a stable imaging environment upon changes of either the composition of the gas mixture or upon switching from one gas to another. The design of the system is described and the response of the pressure inside the microscope, the sample temperature, and sample drift in response to flow and composition changes of the system are reported.

  17. RHIC electron lenses upgrades

    SciTech Connect (OSTI)

    Gu, X.; Altinbas, Z.; Bruno, D.; Binello, S.; Costanzo, M.; Drees, A.; Fischer, W.; Gassner, D. M.; Hock, J.; Hock, K.; Harvey, M.; Luo, Y.; Marusic, A.; Mi, C.; Mernick, K.; Minty, M.; Michnoff, R.; Miller, T. A.; Pikin, A. I.; Robert-Demolaize, G.; Samms, T.; Shrey, T. C.; Schoefer, V.; Tan, Y.; Than, R.; Thieberger, P.; White, S. M.

    2015-05-03

    In the Relativistic Heavy Ion Collider (RHIC) 100 GeV polarized proton run in 2015, two electron lenses were used to partially compensate for the head-on beam-beam effect for the first time. Here, we describe the design of the current electron lens, detailing the hardware modifications made after the 2014 commissioning run with heavy ions. A new electron gun with 15-mm diameter cathode is characterized. The electron beam transverse profile was measured using a YAG screen and fitted with a Gaussian distribution. During operation, the overlap of the electron and proton beams was achieved using the electron backscattering detector in conjunction with an automated orbit control program.

  18. Intra-unit-cell Electronic Nematicity of the High-Tc Copper-oxide Pseudogap States

    SciTech Connect (OSTI)

    Davis, J.C.; Lawler, M.J.; Fujita, K.; Lee, J.; Schmidt, A.R.; Kohsaka, Y.; Kim, C.K.; Eisaki, H.; Uchida, S.; Sethna, J.P.; Kim, E.-A.

    2010-07-15

    In the high-transition-temperature (high-T{sub c}) superconductors the pseudogap phase becomes predominant when the density of doped holes is reduced. Within this phase it has been unclear which electronic symmetries (if any) are broken, what the identity of any associated order parameter might be, and which microscopic electronic degrees of freedom are active. Here we report the determination of a quantitative order parameter representing intra-unit-cell nematicity: the breaking of rotational symmetry by the electronic structure within each CuO{sub 2} unit cell. We analyse spectroscopic-imaging scanning tunnelling microscope images of the intra-unit-cell states in underdoped Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8+{delta}} and, using two independent evaluation techniques, find evidence for electronic nematicity of the states close to the pseudogap energy. Moreover, we demonstrate directly that these phenomena arise from electronic differences at the two oxygen sites within each unit cell. If the characteristics of the pseudogap seen here and by other techniques all have the same microscopic origin, this phase involves weak magnetic states at the O sites that break 90{sup o}-rotational symmetry within every CuO{sub 2} unit cell.

  19. Catalac free electron laser

    DOE Patents [OSTI]

    Brau, Charles A. (Los Alamos, NM); Swenson, Donald A. (Los Alamos, NM); Boyd, Jr., Thomas J. (Los Alamos, NM)

    1982-01-01

    A catalac free electron laser using a rf linac (catalac) which acts as a catalyst to accelerate an electron beam in an initial pass through the catalac and decelerate the electron beam during a second pass through the catalac. During the second pass through the catalac, energy is extracted from the electron beam and transformed to energy of the accelerating fields of the catalac to increase efficiency of the device. Various embodiments disclose the use of post linacs to add electron beam energy extracted by the wiggler and the use of supplementary catalacs to extract energy at various energy peaks produced by the free electron laser wiggler to further enhance efficiency of the catalac free electron laser. The catalac free electron laser can be used in conjunction with a simple resonator, a ring resonator or as an amplifier in conjunction with a master oscillator laser.

  20. Relativistic electron beam generator

    DOE Patents [OSTI]

    Mooney, L.J.; Hyatt, H.M.

    1975-11-11

    A relativistic electron beam generator for laser media excitation is described. The device employs a diode type relativistic electron beam source having a cathode shape which provides a rectangular output beam with uniform current density.

  1. Catalac free electron laser

    DOE Patents [OSTI]

    Brau, C.A.; Swenson, D.A.; Boyd, T.J. Jr.

    1979-12-12

    A catalac free electron laser using a rf linac (catalac) which acts as a catalyst to accelerate an electron beam in an initial pass through the catalac and decelerate the electron beam during a second pass through the catalac is described. During the second pass through the catalac, energy is extracted from the electron beam and transformed to energy of the accelerating fields of the catalac to increase efficiency of the device. Various embodiments disclose the use of post linacs to add electron beam energy extracted by the wiggler and the use of supplementary catalacs to extract energy at various energy peaks produced by the free electron laser wiggler to further enhance efficiency of the catalac free electron laser. The catalac free electron laser can be used in conjunction with a simple resonator, a ring resonator, or as an amplifier in conjunction with a master oscillator laser.

  2. Power Electronics Block Set

    Energy Science and Technology Software Center (OSTI)

    2008-12-31

    The software consists of code that will allow rapid prototyping of advanced power electronics for use in renewable energy systems.

  3. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's electrical charge carriers (electrons and holes) move through a solid with

  4. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's electrical charge carriers (electrons and holes) move through a solid with

  5. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's electrical charge carriers (electrons and holes) move through a solid with

  6. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's electrical charge carriers (electrons and holes) move through a solid with

  7. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's electrical charge carriers (electrons and holes) move through a solid with

  8. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Controlling Graphene's Electronic Structure Print Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's electrical charge carriers (electrons and holes) move through a solid with

  9. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Controlling Graphene's Electronic Structure Controlling Graphene's Electronic Structure Print Wednesday, 25 April 2007 00:00 Graphene, because of its unusual electron properties, reduced dimensionality, and scale, has enormous potential for use in ultrafast electronic transistors. It exhibits high conductivity and an anomalous quantum Hall effect (a phenomenon exhibited by certain semiconductor devices at low temperatures and high magnetic fields). Among its novel properties, graphene's

  10. Comparison of direct current and 50?Hz alternating current microscopic corona characteristics on conductors

    SciTech Connect (OSTI)

    Zhang, Shuai Zhang, Bo He, Jinliang

    2014-06-15

    Corona discharge is one of the major design factors for extra-high voltage and ultra-high voltage DC/AC transmission lines. Under different voltages, corona discharge reveals different characteristics. This paper aims at investigating DC and AC coronas on the microscopic scale. To obtain the specific characteristics of DC and AC coronas, a new measurement approach that utilizes a coaxial wire-cylinder corona cage is designed in this paper, and wires of different diameters are used in the experiment. Based on the measurements, the respective microscopic characteristics of DC and AC coronas are analyzed and compared. With differences in characteristics between DC and AC coronas proposed, this study provides useful insights into DC/AC corona discharges on transmission line applications.

  11. Performance of bent-crystal x-ray microscopes for high energy density physics research

    SciTech Connect (OSTI)

    Schollmeier, Marius S.; Geissel, Matthias; Shores, Jonathon E.; Smith, Ian C.; Porter, John L.

    2015-05-29

    We present calculations for the field of view (FOV), image fluence, image monochromaticity, spectral acceptance, and image aberrations for spherical crystal microscopes, which are used as self-emission imaging or backlighter systems at large-scale high energy density physics facilities. Our analytic results are benchmarked with ray-tracing calculations as well as with experimental measurements from the 6.151 keV backlighter system at Sandia National Laboratories. Furthermore, the analytic expressions can be used for x-ray source positions anywhere between the Rowland circle and object plane. We discovered that this enables quick optimization of the performance of proposed but untested, bent-crystal microscope systems to find the best compromise between FOV, image fluence, and spatial resolution for a particular application.

  12. Performance of bent-crystal x-ray microscopes for high energy density physics research

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Schollmeier, Marius S.; Geissel, Matthias; Shores, Jonathon E.; Smith, Ian C.; Porter, John L.

    2015-05-29

    We present calculations for the field of view (FOV), image fluence, image monochromaticity, spectral acceptance, and image aberrations for spherical crystal microscopes, which are used as self-emission imaging or backlighter systems at large-scale high energy density physics facilities. Our analytic results are benchmarked with ray-tracing calculations as well as with experimental measurements from the 6.151 keV backlighter system at Sandia National Laboratories. Furthermore, the analytic expressions can be used for x-ray source positions anywhere between the Rowland circle and object plane. We discovered that this enables quick optimization of the performance of proposed but untested, bent-crystal microscope systems to findmore » the best compromise between FOV, image fluence, and spatial resolution for a particular application.« less

  13. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope

    SciTech Connect (OSTI)

    Imtiaz, Atif; Wallis, Thomas M.; Brubaker, Matt D.; Blanchard, Paul T.; Bertness, Kris A.; Sanford, Norman A.; Kabos, Pavel; Weber, Joel C.; Coakley, Kevin J.

    2014-06-30

    We used a broadband, atomic-force-microscope-based, scanning microwave microscope (SMM) to probe the axial dependence of the charge depletion in a p-n junction within a gallium nitride nanowire (NW). SMM enables the visualization of the p-n junction location without the need to make patterned electrical contacts to the NW. Spatially resolved measurements of S{sub 11}{sup ?}, which is the derivative of the RF reflection coefficient S{sub 11} with respect to voltage, varied strongly when probing axially along the NW and across the p-n junction. The axial variation in S{sub 11}{sup ?}? effectively mapped the asymmetric depletion arising from the doping concentrations on either side of the junction. Furthermore, variation of the probe tip voltage altered the apparent extent of features associated with the p-n junction in S{sub 11}{sup ?} images.

  14. Time resolved electron microscopy for in situ experiments

    SciTech Connect (OSTI)

    Campbell, Geoffrey H. McKeown, Joseph T.; Santala, Melissa K.

    2014-12-15

    Transmission electron microscopy has functioned for decades as a platform for in situ observation of materials and processes with high spatial resolution. Yet, the dynamics often remain elusive, as they unfold too fast to discern at these small spatial scales under traditional imaging conditions. Simply shortening the exposure time in hopes of capturing the action has limitations, as the number of electrons will eventually be reduced to the point where noise overtakes the signal in the image. Pulsed electron sources with high instantaneous current have successfully shortened exposure times (thus increasing the temporal resolution) by about six orders of magnitude over conventional sources while providing the necessary signal-to-noise ratio for dynamic imaging. We describe here the development of this new class of microscope and the principles of its operation, with examples of its application to problems in materials science.

  15. Present State of Electron Backscatter Diffraction and Prospective Developments

    SciTech Connect (OSTI)

    Schwarzer, R A; Field, D P; Adams, B L; Kumar, M; Schwartz, A J

    2008-10-24

    Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystals. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade (Schwartz et al. 2000) due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complementary information about the microstructure on a submicron scale. From the same specimen area, surface structure and morphology of the microstructure are characterized in great detail by the relief and orientation contrast in secondary and backscatter electron images, element distributions are accessed by energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy (WDS), or cathodoluminescence analysis, and the orientations of single grains and phases can now be determined, as a complement, by EBSD.

  16. In-Situ Electrochemical Transmission Electron Microscopy for Battery Research

    SciTech Connect (OSTI)

    Mehdi, Beata L; Gu, Meng; Parent, Lucas; Xu, WU; Nasybulin, Eduard; Chen, Xilin; Unocic, Raymond R; Xu, Pinghong; Welch, David; Abellan, Patricia; Zhang, Ji-Guang; Liu, Jun; Wang, Chongmin; Arslan, Ilke; Evans, James E; Browning, Nigel

    2014-01-01

    The recent development of in-situ liquid stages for (scanning) transmission electron microscopes now makes it possible for us to study the details of electrochemical processes under operando conditions. As electrochemical processes are complex, care must be taken to calibrate the system before any in-situ/operando observations. In addition, as the electron beam can cause effects that look similar to electrochemical processes at the electrolyte/electrode interface, an understanding of the role of the electron beam in modifying the operando observations must also be understood. In this paper we describe the design, assembly, and operation of an in-situ electrochemical cell, paying particular attention to the method for controlling and quantifying the experimental parameters. The use of this system is then demonstrated for the lithiation/delithiation of silicon nanowires.

  17. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Print NASA's $200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81P/Wild 2. Four ALS beamlines and the researchers using them were among the hundreds of scientists and dozens of experimental techniques in facilities around the world that contributed to the preliminary examination of the first samples. Adding to recent advances in cometary science showing the

  18. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Print NASA's $200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81P/Wild 2. Four ALS beamlines and the researchers using them were among the hundreds of scientists and dozens of experimental techniques in facilities around the world that contributed to the preliminary examination of the first samples. Adding to recent advances in cometary science showing the

  19. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Print NASA's $200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81P/Wild 2. Four ALS beamlines and the researchers using them were among the hundreds of scientists and dozens of experimental techniques in facilities around the world that contributed to the preliminary examination of the first samples. Adding to recent advances in cometary science showing the

  20. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Print NASA's $200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81P/Wild 2. Four ALS beamlines and the researchers using them were among the hundreds of scientists and dozens of experimental techniques in facilities around the world that contributed to the preliminary examination of the first samples. Adding to recent advances in cometary science showing the

  1. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Print NASA's $200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81P/Wild 2. Four ALS beamlines and the researchers using them were among the hundreds of scientists and dozens of experimental techniques in facilities around the world that contributed to the preliminary examination of the first samples. Adding to recent advances in cometary science showing the

  2. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Print NASA's $200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81P/Wild 2. Four ALS beamlines and the researchers using them were among the hundreds of scientists and dozens of experimental techniques in facilities around the world that contributed to the preliminary examination of the first samples. Adding to recent advances in cometary science showing the

  3. Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Particles from Comet 81P/Wild 2 Viewed by ALS Microscopes Print NASA's $200-million, seven-year-long Stardust mission returned to Earth thousands of tiny particles snagged from the coma of comet 81P/Wild 2. Four ALS beamlines and the researchers using them were among the hundreds of scientists and dozens of experimental techniques in facilities around the world that contributed to the preliminary examination of the first samples. Adding to recent advances in cometary science showing the

  4. SEM technique for imaging and measuring electronic transport in nanocomposites based on electric field induced contrast

    DOE Patents [OSTI]

    Jesse, Stephen [Knoxville, TN; Geohegan, David B. [Knoxville, TN; Guillorn, Michael [Brooktondale, NY

    2009-02-17

    Methods and apparatus are described for SEM imaging and measuring electronic transport in nanocomposites based on electric field induced contrast. A method includes mounting a sample onto a sample holder, the sample including a sample material; wire bonding leads from the sample holder onto the sample; placing the sample holder in a vacuum chamber of a scanning electron microscope; connecting leads from the sample holder to a power source located outside the vacuum chamber; controlling secondary electron emission from the sample by applying a predetermined voltage to the sample through the leads; and generating an image of the secondary electron emission from the sample. An apparatus includes a sample holder for a scanning electron microscope having an electrical interconnect and leads on top of the sample holder electrically connected to the electrical interconnect; a power source and a controller connected to the electrical interconnect for applying voltage to the sample holder to control the secondary electron emission from a sample mounted on the sample holder; and a computer coupled to a secondary electron detector to generate images of the secondary electron emission from the sample.

  5. Jianguo Wen | Argonne National Laboratory

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Jianguo Wen Materials Scientist Education BS, Physics Department, Wuhan University Ph.D., Institute of Physics, Chinese Academy of Sciences Postdoctoral Fellow, Delft University of Technology, The Netherlands Research Interests Research focuses on development and application of spherical and chromatic aberration-corrected transmission electron microscopy techniques to solve materials problems in catalysts, battery materials, photovoltaic films, and ferroelectric, piezolectric, and

  6. Atomically-resolved mapping of polarization and electric fields across ferroelectric-oxide interfaces by Z-contrast imaging

    SciTech Connect (OSTI)

    Chang, Hye Jung; Kalinin, Sergei; Morozovska, A. N.; Huijben, Mark; Chu, Ying-Hao; Yu, P; Ramesh, R.; Eliseev, E. A.; Svechnikov, S. V.; Pennycook, Stephen J; Borisevich, Albina Y

    2011-01-01

    Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a-STEM image, b-corresponding displacement profile) is combined with Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.

  7. Continuum-kinetic-microscopic model of lung clearance due to core-annular fluid entrainment

    SciTech Connect (OSTI)

    Mitran, Sorin

    2013-07-01

    The human lung is protected against aspirated infectious and toxic agents by a thin liquid layer lining the interior of the airways. This airway surface liquid is a bilayer composed of a viscoelastic mucus layer supported by a fluid film known as the periciliary liquid. The viscoelastic behavior of the mucus layer is principally due to long-chain polymers known as mucins. The airway surface liquid is cleared from the lung by ciliary transport, surface tension gradients, and airflow shear forces. This work presents a multiscale model of the effect of airflow shear forces, as exerted by tidal breathing and cough, upon clearance. The composition of the mucus layer is complex and variable in time. To avoid the restrictions imposed by adopting a viscoelastic flow model of limited validity, a multiscale computational model is introduced in which the continuum-level properties of the airway surface liquid are determined by microscopic simulation of long-chain polymers. A bridge between microscopic and continuum levels is constructed through a kinetic-level probability density function describing polymer chain configurations. The overall multiscale framework is especially suited to biological problems due to the flexibility afforded in specifying microscopic constituents, and examining the effects of various constituents upon overall mucus transport at the continuum scale.

  8. Microscopic model versus systematic low-energy effective field theory for a doped quantum ferromagnet

    SciTech Connect (OSTI)

    Gerber, U.; Wiese, U.-J.; Hofmann, C. P.; Kaempfer, F.

    2010-02-01

    We consider a microscopic model for a doped quantum ferromagnet as a test case for the systematic low-energy effective field theory for magnons and holes, which is constructed in complete analogy to the case of quantum antiferromagnets. In contrast to antiferromagnets, for which the effective field theory approach can be tested only numerically, in the ferromagnetic case, both the microscopic and the effective theory can be solved analytically. In this way, the low-energy parameters of the effective theory are determined exactly by matching to the underlying microscopic model. The low-energy behavior at half-filling as well as in the single- and two-hole sectors is described exactly by the systematic low-energy effective field theory. In particular, for weakly bound two-hole states the effective field theory even works beyond perturbation theory. This lends strong support to the quantitative success of the systematic low-energy effective field theory method not only in the ferromagnetic but also in the physically most interesting antiferromagnetic case.

  9. Electronics Stewardship | Department of Energy

    Office of Environmental Management (EM)

    Electronics Stewardship Electronics Stewardship Mission The team promotes sustainable management of LM's electronic equipment, as deemed appropriate for LM operations and approved ...

  10. Electron emitting filaments for electron discharge devices

    DOE Patents [OSTI]

    Leung, K.N.; Pincosy, P.A.; Ehlers, K.W.

    1983-06-10

    Electrons are copiously emitted by a device comprising a loop-shaped filament made of lanthanum hexaboride. The filament is directly heated by an electrical current produced along the filament by a power supply connected to the terminal legs of the filament. To produce a filament, a diamond saw or the like is used to cut a slice from a bar made of lanthanum hexaboride. The diamond saw is then used to cut the slice into the shape of a loop which may be generally rectangular, U-shaped, hairpin-shaped, zigzag-shaped, or generally circular. The filaments provide high electron emission at a relatively low operating temperature, such as 1600/sup 0/C. To achieve uniform heating, the filament is formed with a cross section which is tapered between the opposite ends of the filament to compensate for nonuniform current distribution along the filament due to the emission of electrons from the filament.

  11. Electron emitting filaments for electron discharge devices

    DOE Patents [OSTI]

    Leung, Ka-Ngo; Pincosy, Philip A.; Ehlers, Kenneth W.

    1988-01-01

    Electrons are copiously emitted by a device comprising a loop-shaped filament made of lanthanum hexaboride. The filament is directly heated by an electrical current produced along the filament by a power supply connected to the terminal legs of the filament. To produce a filament, a diamond saw or the like is used to cut a slice from a bar made of lanthanum hexaboride. The diamond saw is then used to cut the slice into the shape of a loop which may be generally rectangular, U-shaped, hairpin-shaped, zigzag-shaped, or generally circular. The filaments provide high electron emission at a relatively low operating temperature, such as 1600.degree. C. To achieve uniform heating, the filament is formed with a cross section which is tapered between the opposite ends of the filament to compensate for non-uniform current distribution along the filament due to the emission of electrons from the filament.

  12. Electronic contribution to friction on GaAs

    SciTech Connect (OSTI)

    Applied Science and Technology Graduate Group, UC Berkeley; Dept. of Materials Sciences and Engineering, UC Berkeley; Salmeron, Miquel; Qi, Yabing; Park, J.Y.; Hendriksen, B.L.M.; Ogletree, D.F.; Salmeron, Miquel

    2008-04-15

    The electronic contribution to friction at semiconductor surfaces was investigated by using a Pt-coated tip with 50nm radius in an atomic force microscope sliding against an n-type GaAs(100) substrate. The GaAs surface was covered by an approximately 1 nm thick oxide layer. Charge accumulation or depletion was induced by the application of forward or reverse bias voltages. We observed a substantial increase in friction force in accumulation (forward bias) with respect to depletion (reverse bias). We propose a model based on the force exerted by the trapped charges that quantitatively explains the experimental observations of excess friction.

  13. Field emission electron source

    DOE Patents [OSTI]

    Zettl, Alexander Karlwalter; Cohen, Marvin Lou

    2000-01-01

    A novel field emitter material, field emission electron source, and commercially feasible fabrication method is described. The inventive field emission electron source produces reliable electron currents of up to 400 mA/cm.sup.2 at 200 volts. The emitter is robust and the current it produces is not sensitive to variability of vacuum or the distance between the emitter tip and the cathode. The novel emitter has a sharp turn-on near 100 volts.

  14. Ceramic Electron Multiplier

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Comby, G.

    1996-10-01

    The Ceramic Electron Multipliers (CEM) is a compact, robust, linear and fast multi-channel electron multiplier. The Multi Layer Ceramic Technique (MLCT) allows to build metallic dynodes inside a compact ceramic block. The activation of the metallic dynodes enhances their secondary electron emission (SEE). The CEM can be used in multi-channel photomultipliers, multi-channel light intensifiers, ion detection, spectroscopy, analysis of time of flight events, particle detection or Cherenkov imaging detectors. (auth)

  15. Electronic Recordkeeping System Questionnaire

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    5 (04/2015) U.S. DEPARTMENT OF ENERGY Electronic Recordkeeping System Questionnaire INSTRUCTIONS: System owners should work in consultation with their organization's records contacts to ensure the accurate completion of a separate questionnaire for each electronic recordkeeping system. Federal regulations require proper address of recordkeeping requirements and disposition before approving new electronic information systems (EIS) or enhancements to existing EISes. OMB Circular A-130 requires

  16. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    spectroscopy (ARPES) at ALS Beamline 7.0.1, a team of scientists from the ALS and Germany characterized the electronic band structure and successfully controlled the gap...

  17. Research and Design of a Sample Heater for Beam Line 6-2c Transmission X-ray Microscope

    SciTech Connect (OSTI)

    Policht, Veronica; /Loyola U., Chicago /SLAC

    2012-08-27

    There exists a need for environmental control of samples to be imaged by the Transmission X-Ray Microscope (TXM) at the SSRLs Beam Line 6-2c. In order to observe heat-driven chemical or morphological changes that normally occur in situ, microscopes require an additional component that effectively heats a given sample without heating any of the microscope elements. The confinement of the heat and other concerns about the heaters integrity limit which type of heater is appropriate for the TXM. The bulk of this research project entails researching different heating methods used previously in microscopes, but also in other industrial applications, with the goal of determining the best-fitting method, and finally in designing a preliminary sample heater.

  18. Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

    SciTech Connect (OSTI)

    Torun, H.; Torello, D.; Degertekin, F. L.

    2011-08-15

    The authors describe a method of actuation for atomic force microscope (AFM) probes to improve imaging speed and displacement range simultaneously. Unlike conventional piezoelectric tube actuation, the proposed method involves a lever and fulcrum ''seesaw'' like actuation mechanism that uses a small, fast piezoelectric transducer. The lever arm of the seesaw mechanism increases the apparent displacement range by an adjustable gain factor, overcoming the standard tradeoff between imaging speed and displacement range. Experimental characterization of a cantilever holder implementing the method is provided together with comparative line scans obtained with contact mode imaging. An imaging bandwidth of 30 kHz in air with the current setup was demonstrated.

  19. Automated video-microscopic imaging and data acquisition system for colloid deposition measurements

    DOE Patents [OSTI]

    Abdel-Fattah, Amr I.; Reimus, Paul W.

    2004-12-28

    A video microscopic visualization system and image processing and data extraction and processing method for in situ detailed quantification of the deposition of sub-micrometer particles onto an arbitrary surface and determination of their concentration across the bulk suspension. The extracted data includes (a) surface concentration and flux of deposited, attached and detached colloids, (b) surface concentration and flux of arriving and departing colloids, (c) distribution of colloids in the bulk suspension in the direction perpendicular to the deposition surface, and (d) spatial and temporal distributions of deposited colloids.

  20. Bi-Sr-Ca-Cu-O surface studied by means of scanning tunnelling microscope

    SciTech Connect (OSTI)

    Witek, A.; Dabkowski, A.; Rauluszkiewicz, J.

    1989-03-10

    Surface topography of the high-T/sub c/ superconductor BiSrCaCu/sub 2/O/sub x/ has been investigated by means of scanning tunnelling microscope. The measurements were performed on the natural surface of ceramics material in air at room temperature. It can be deduced from the surface images, that bulk orthorhombic crystal structure extends to the surface. The surface seems to be uniform metallic in character and not drastically contaminated. Regular steps observed on the surface correspond to the dimension of the unit cell in z direction or its multiples.

  1. Electronic Mail Analysis Capability

    Broader source: Directives, Delegations, and Requirements [Office of Management (MA)]

    2001-01-08

    Establishes the pilot program to test the Department of Energy (DOE) Electronic Mail Analysis Capability (EMAC), which will be used to monitor and analyze outgoing and incoming electronic mail (e-mail) from the National Nuclear Security Administration (NNSA) and DOE laboratories that are engaged in nuclear weapons design or work involving special nuclear material. No cancellation.

  2. High brightness electron accelerator

    DOE Patents [OSTI]

    Sheffield, Richard L.; Carlsten, Bruce E.; Young, Lloyd M.

    1994-01-01

    A compact high brightness linear accelerator is provided for use, e.g., in a free electron laser. The accelerator has a first plurality of acclerating cavities having end walls with four coupling slots for accelerating electrons to high velocities in the absence of quadrupole fields. A second plurality of cavities receives the high velocity electrons for further acceleration, where each of the second cavities has end walls with two coupling slots for acceleration in the absence of dipole fields. The accelerator also includes a first cavity with an extended length to provide for phase matching the electron beam along the accelerating cavities. A solenoid is provided about the photocathode that emits the electons, where the solenoid is configured to provide a substantially uniform magnetic field over the photocathode surface to minimize emittance of the electons as the electrons enter the first cavity.

  3. Electron: Cluster interactions

    SciTech Connect (OSTI)

    Scheidemann, A.A.; Kresin, V.V.; Knight, W.D.

    1994-02-01

    Beam depletion spectroscopy has been used to measure absolute total inelastic electron-sodium cluster collision cross sections in the energy range from E {approximately} 0.1 to E {approximately} 6 eV. The investigation focused on the closed shell clusters Na{sub 8}, Na{sub 20}, Na{sub 40}. The measured cross sections show an increase for the lowest collision energies where electron attachment is the primary scattering channel. The electron attachment cross section can be understood in terms of Langevin scattering, connecting this measurement with the polarizability of the cluster. For energies above the dissociation energy the measured electron-cluster cross section is energy independent, thus defining an electron-cluster interaction range. This interaction range increases with the cluster size.

  4. Electrons and Mirror Symmetry

    SciTech Connect (OSTI)

    Kumar, Krishna

    2007-04-04

    The neutral weak force between an electron and a target particle, mediated by the Z boson, can be isolated by measuring the fractional change under a mirror reflection of the scattering probability of relativistic longitudinally polarized electrons off unpolarized targets. This technique yields neutral weak force measurements at a length scale of 1 femtometer, in contrast to high energy collider measurements that probe much smaller length scales. Study of the variation of the weak force over a range of length scales provides a stringent test of theory, complementing collider measurements. We describe a recent measurement of the neutral weak force between two electrons by the E158 experiment at the Stanford Linear Accelerator Center. While the weak force between an electron and positron has been extensively studied, that between two electrons had never directly been measured. We conclude by discussing prospects for even more precise measurements at future facilities.

  5. Electrons and Mirror Symmetry

    ScienceCinema (OSTI)

    Kumar, Krishna

    2009-09-01

    The neutral weak force between an electron and a target particle, mediated by the Z boson, can be isolated by measuring the fractional change under a mirror reflection of the scattering probability of relativistic longitudinally polarized electrons off unpolarized targets. This technique yields neutral weak force measurements at a length scale of 1 femtometer, in contrast to high energy collider measurements that probe much smaller length scales. Study of the variation of the weak force over a range of length scales provides a stringent test of theory, complementing collider measurements. We describe a recent measurement of the neutral weak force between two electrons by the E158 experiment at the Stanford Linear Accelerator Center. While the weak force between an electron and positron has been extensively studied, that between two electrons had never directly been measured. We conclude by discussing prospects for even more precise measurements at future facilities.

  6. The microscopic structure of charge density waves in underdoped YBa2Cu3O6.54 revealed by x-ray diffraction

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    E. M. Forgan; Huecker, M.; Blackburn, E.; Holmes, A. T.; Briffa, A. K. R.; Chang, J.; Bouchenoire, L.; Brown, S. D.; Liang, Ruixing; Bonn, D.; et al

    2015-12-09

    Charge density wave (CDW) order appears throughout the underdoped high-temperature cuprate superconductors, but the underlying symmetry breaking and the origin of the CDW remain unclear. We use X-ray diffraction to determine the microscopic structure of the CDWs in an archetypical cuprate YBa2Cu3O6.54 at its superconducting transition temperature ~60 K. We find that the CDWs in this material break the mirror symmetry of the CuO2 bilayers. The ionic displacements in the CDWs have two components, which are perpendicular and parallel to the CuO2 planes, and are out of phase with each other. The planar oxygen atoms have the largest displacements, perpendicularmore » to the CuO2 planes. Our results allow many electronic properties of the underdoped cuprates to be understood. For example, the CDWs will lead to local variations in the electronic structure, giving an explicit explanation of density-wave states with broken symmetry observed in scanning tunnelling microscopy and soft X-ray measurements.« less

  7. Simulations of Gaussian electron guns for RHIC electron lens

    SciTech Connect (OSTI)

    Pikin, A.

    2014-02-28

    Simulations of two versions of the electron gun for RHIC electron lens are presented. The electron guns have to generate an electron beam with Gaussian radial profile of the electron beam density. To achieve the Gaussian electron emission profile on the cathode we used a combination of the gun electrodes and shaping of the cathode surface. Dependence of electron gun performance parameters on the geometry of electrodes and the margins for electrodes positioning are presented.

  8. Uranium transport in Topopah spring tuff; An ion-microscope investigation

    SciTech Connect (OSTI)

    McKeegan, K.D.; Phinney, D.; Oversby, V.M.; Buchholtz-tenBrink, M.; Smith, D.K.

    1989-12-31

    The authors discuss their investigation of the effect of different methods of surface preparation on ion-microscope profiles of uranium concentration (added to the sample by diffusion from an aqueous solution) vs depth in a welded, devitrified, tuffaceous rock from Yucca Mountain. The concentration profiles were used to study transport of uranium in the tuff. Four wafers of rock were prepared from primary drill core material and finished by polishing with increasingly finer abrasive material. Final polishes were made with 400 grit SiC, 600 grit SiC, 0.3{mu}m alumina, and 0.05{mu}m alumina. The polished tuff wafers were exposed for eight hours to a solution of groundwater doped with 2 ppm 235-U. The wafers were then examined by SEM and the ion microscope was used to measure the lateral and depth distributions of 235-U and other isotopes in the wafer. No systematic correlation of the measured 235-U concentration- vs-depth profiles with the degree of surface finish was observed, indicating that the polishing does not affect the measurable transport of U in the tuff.

  9. Development and evaluation of an automated reflectance microscope system for the petrographic characterization of bituminous coals

    SciTech Connect (OSTI)

    Hoover, D. S.; Davis, A.

    1980-10-01

    The development of automated coal petrographic techniques will lessen the demands on skilled personnel to do routine work. This project is concerned with the development and successful testing of an instrument which will meet these needs. The fundamental differences in reflectance of the three primary maceral groups should enable their differentiation in an automated-reflectance frequency histogram (reflectogram). Consequently, reflected light photometry was chosen as the method for automating coal petrographic analysis. Three generations of an automated system (called Rapid Scan Versions I, II and III) were developed and evaluated for petrographic analysis. Their basic design was that of a reflected-light microscope photometer with an automatic stage, interfaced with a minicomputer. The hardware elements used in the Rapid Scan Version I limited the system's flexibility and presented problems with signal digitization and measurement precision. Rapid Scan Version II was designed to incorporate a new microscope photometer and computer system. A digital stepping stage was incorporated into the Rapid Scan Version III system. The precision of reflectance determination of this system was found to be +- 0.02 percent reflectance. The limiting factor in quantitative interpretation of Rapid Scan reflectograms is the resolution of reflectance populations of the individual maceral groups. Statistical testing indicated that reflectograms were highly reproducible, and a new computer program, PETAN, was written to interpret the curves for vitrinite reflectance parameters ad petrographic.

  10. Microscopic Dynamics in Nanocomposite Photosensitive Films Studies by X-ray Photon Correlation Spectroscopy

    SciTech Connect (OSTI)

    D Orsi; L Cristofolini; M Fontant; E Pontecorvo; C Caronna; A Fluerasu; F Zontone; A Madsen

    2011-12-31

    X-ray photon correlation spectroscopy measurements are reported of microscale dynamics in Langmuir-Schaeffer deposited multilayers of a photosensitive azopolymer with a low concentration of gold nanoparticles embedded. Correlation functions were measured as a function of exchanged momentum and illumination conditions (dark and UV light) and fitted with the Kohlrausch-Williams-Watts (KWW) exponential form. The microscopic dynamic of the nanoparticles was quantified, evidencing a non-Brownian superdiffusive behavior with relaxation times {tau} {approx} q{sup -1}, a result analogous to what previously had been observed in the pure azopolymer. Such behavior has been related to intermittent rearrangements or random dipolar interactions within an elastic medium. Photoperturbation with UV light makes the dynamics faster, in accordance with the reduction of the viscosity of the polymer found by shear rheology, but the KWW form of the correlation functions persists. At constant temperature, the dynamics of the nanoparticles embedded in the polymeric matrix is sensibly faster than the slow microscopic dynamic of the polymer. At the same time, the Vogel-Fulcher-Tammann law for the relaxation times indicates a less pronounced temperature dependence than for the pure polymer, resulting in a slightly lower activation temperature T{sub A}.

  11. Imaging and microanalysis of thin ionomer layers by scanning transmission electron microscopy

    SciTech Connect (OSTI)

    Cullen, David A; Koestner, Roland; Kukreja, Ratan; Minko, Sergiy; Trotsenko, Oleksandr; Tokarev, Alexander V; Guetaz, Laure; Meyer III, Harry M; Parish, Chad M; More, Karren Leslie

    2014-01-01

    Improved conditions for imaging and spectroscopic mapping of thin perfluorosulfonic acid (PFSA) ionomer layers in fuel cell electrodes by scanning transmission electron microscopy (STEM) have been investigated. These conditions are first identified on model systems of Nafion ionomer-coated nanostructured thin films and nanoporous Si. The optimized conditions are then applied in a quantitative study of the ionomer through-layer loading for two typical electrode catalyst coatings using electron energy loss and energy dispersive X-ray spectroscopy in the transmission electron microscope. The e-beam induced damage to the perfluorosulfonic acid (PFSA) ionomer is quantified by following the fluorine mass loss with electron exposure and is then mitigated by a few orders of magnitude using cryogenic specimen cooling and a higher incident electron voltage. Multivariate statistical analysis is also applied to the analysis of spectrum images for data denoising and unbiased separation of independent components related to the catalyst, ionomer, and support.

  12. Coherent electron cooling

    SciTech Connect (OSTI)

    Litvinenko,V.

    2009-05-04

    Cooling intense high-energy hadron beams remains a major challenge in modern accelerator physics. Synchrotron radiation is still too feeble, while the efficiency of two other cooling methods, stochastic and electron, falls rapidly either at high bunch intensities (i.e. stochastic of protons) or at high energies (e-cooling). In this talk a specific scheme of a unique cooling technique, Coherent Electron Cooling, will be discussed. The idea of coherent electron cooling using electron beam instabilities was suggested by Derbenev in the early 1980s, but the scheme presented in this talk, with cooling times under an hour for 7 TeV protons in the LHC, would be possible only with present-day accelerator technology. This talk will discuss the principles and the main limitations of the Coherent Electron Cooling process. The talk will describe the main system components, based on a high-gain free electron laser driven by an energy recovery linac, and will present some numerical examples for ions and protons in RHIC and the LHC and for electron-hadron options for these colliders. BNL plans a demonstration of the idea in the near future.

  13. Aerogels for electronics

    SciTech Connect (OSTI)

    Hrubesh, L.W.

    1994-10-01

    In addition to their other exceptional properties, aerogels also exhibit unusual dielectric and electronic properties due to their nano-sized structures and high porosities. For example, aerogels have the lowest dielectric constants measured for a solid material (having values approaching 1.0); they have exceptionally high dielectric resistivities and strengths (i.e., ability to insulate very high voltages); they exhibit low dielectric loss at microwave frequencies; and some aerogels are electrically conductive and photoconductive. These properties are being exploited to provide the next generation of materials for energy storage, low power consumption, and ultra-fast electronics. We are working toward adapting these unusual materials for microelectronic applications, particularly, making thin aerogel films for dielectric substrates and for energy storage devices such as supercapacitors. Measurements are presented in this paper for the dielectric and electronic properties of aerogels, including the dielectric constant, loss factor, dielectric and electrical conductivity, volume resistivity, and dielectric strength. We also describe methods to form and characterize thin aerogel films which are being developed for numerous electronic applications. Finally, some of the electronic applications proposed for aerogels are presented. Commercialization of aerogels for electronics must await further feasibility, prototype development, and cost studies, but they are one of the key materials and are sure to have a major impact on future electronics.

  14. Electron-beam activated thermal sputtering of thermoelectric materials

    SciTech Connect (OSTI)

    Wu Jinsong; Dravid, Vinayak P.; He Jiaqing; Han, Mi-Kyung; Sootsman, Joseph R.; Girard, Steven; Arachchige, Indika U.; Kanatzidis, Mercouri G.

    2011-08-15

    Thermoelectricity and Seebeck effect have long been observed and validated in bulk materials. With the development of advanced tools of materials characterization, here we report the first observation of such an effect in the nanometer scale: in situ directional sputtering of several thermoelectric materials inside electron microscopes. The temperature gradient introduced by the electron beam creates a voltage-drop across the samples, which enhances spontaneous sputtering of specimen ions. The sputtering occurs along a preferential direction determined by the direction of the temperature gradient. A large number of nanoparticles form and accumulate away from the beam location as a result. The sputtering and re-crystallization are found to occur at temperatures far below the melting points of bulk materials. The sputtering occurs even when a liquid nitrogen cooling holder is used to keep the overall temperature at -170 deg. C. This unique phenomenon that occurred in the nanometer scale may provide useful clues to understanding the mechanism of thermoelectric effect.

  15. Electron-beam activated thermal sputtering of thermoelectric materials.

    SciTech Connect (OSTI)

    Wu, J.; He, J.; Han, M-K.; Sootsman, J. R.; Girard, S.; Arachchige, I. U.; Kanatzidis, M. G.; Dravid, V. P.

    2011-08-01

    Thermoelectricity and Seebeck effect have long been observed and validated in bulk materials. With the development of advanced tools of materials characterization, here we report the first observation of such an effect in the nanometer scale: in situ directional sputtering of several thermoelectric materials inside electron microscopes. The temperature gradient introduced by the electron beam creates a voltage-drop across the samples, which enhances spontaneous sputtering of specimen ions. The sputtering occurs along a preferential direction determined by the direction of the temperature gradient. A large number of nanoparticles form and accumulate away from the beam location as a result. The sputtering and re-crystallization are found to occur at temperatures far below the melting points of bulk materials. The sputtering occurs even when a liquid nitrogen cooling holder is used to keep the overall temperature at -170 C. This unique phenomenon that occurred in the nanometer scale may provide useful clues to understanding the mechanism of thermoelectric effect.

  16. Wide Bandgap Power Electronics

    Office of Environmental Management (EM)

    ... coal power plant. 463 In addition to power savings, an important benefit of using high frequency GaN electronics is that the 464 adapter size can be reduced by 10x. Consumers ...

  17. Controlling Graphene's Electronic Structure

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    momentum because the electrons are restricted to motion in a two-dimensional plane. The Dirac crossing points are at energy ED. 2D Perfection in a 3D World Graphene, a perfect...

  18. Electron Heat Transport Measured

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Heat Transport Measured in a Stochastic Magnetic Field T. M. Biewer, * C. B. Forest, ... limit of s &29; 1, RR assumed the electron heat flux to be diffusive, obeying Fourier's ...

  19. Micrometer-resolved film dosimetry using a microscope in microbeam radiation therapy

    SciTech Connect (OSTI)

    Bartzsch, Stefan Oelfke, Uwe; Lott, Johanna; Welsch, Katrin; Bruer-Krisch, Elke

    2015-07-15

    Purpose: Microbeam radiation therapy (MRT) is a still preclinical tumor therapy approach that uses arrays of a few tens of micrometer wide parallel beams separated by a few 100 ?m. The production, measurement, and planning of such radiation fields are a challenge up to now. Here, the authors investigate the feasibility of radiochromic film dosimetry in combination with a microscopic readout as a tool to validate peak and valley doses in MRT, which is an important requirement for a future clinical application of the therapy. Methods: Gafchromic{sup } HD-810 and HD-V2 films are exposed to MRT fields at the biomedical beamline ID17 of the European Synchrotron Radiation Facility (ESRF) and are afterward scanned with a microscope. The measured dose is compared with Monte Carlo calculations. Image analysis tools and film handling protocols are developed that allow accurate and reproducible dosimetry. The performance of HD-810 and HD-V2 films is compared and a detailed analysis of the resolution, noise, and energy dependence is carried out. Measurement uncertainties are identified and analyzed. Results: The dose was measured with a resolution of 5 1000 ?m{sup 2} and an accuracy of 5% in the peak and between 10% and 15% in the valley region. As main causes for dosimetry uncertainties, statistical noise, film inhomogeneities, and calibration errors were identified. Calibration errors strongly increase at low doses and exceeded 3% for doses below 50 and 70 Gy for HD-V2 and HD-810 films, respectively. While the grain size of both film types is approximately 2 ?m, the statistical noise in HD-V2 is much higher than in HD-810 films. However, HD-810 films show a higher energy dependence at low photon energies. Conclusions: Both film types are appropriate for dosimetry in MRT and the microscope is superior to the microdensitometer used before at the ESRF with respect to resolution and reproducibility. However, a very careful analysis of the image data is required. Dosimetry at

  20. Free electron laser

    DOE Patents [OSTI]

    Villa, Francesco

    1990-01-01

    A high gain, single-pass free electron laser formed of a high brilliance electron injector source, a linear accelerator which imparts high energy to the electron beam, and an undulator capable of extremely high magnetic fields, yet with a very short period. The electron injector source is the first stage (gap) of the linear accelerator or a radial line transformer driven by fast circular switch. The linear accelerator is formed of a plurality of accelerating gaps arranged in series. These gaps are energized in sequence by releasing a single pulse of energy which propagates simultaneously along a plurality of transmission lines, each of which feeds the gaps. The transmission lines are graduated in length so that pulse power is present at each gap as the accelerated electrons pass therethrough. The transmission lines for each gap are open circuited at their ends. The undualtor has a structure similar to the accelerator, except that the transmission lines for each gap are substantially short circuited at their ends, thus converting the electric field into magnetic field. A small amount of resistance is retained in order to generate a small electric field for replenishing the electron bunch with the energy lost as it traverses through the undulator structure.

  1. Electronics Stewardship | Department of Energy

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    Electronics Stewardship Electronics Stewardship DOE is committed to responsible environmental stewardship of its electronics, including computers, displays, printers and cell phones. In order to comply with Executive Order 13693, Planning for Federal Sustainability in the Next Decade, and other statutory requirements, DOE policy and actions support the following principles of electronic stewardship: procuring environmentally sustainable electronics, including EPEAT-registered, ENERGY STAR

  2. Microscopic description of the pygmy dipole resonance and its contribution to radiative capture

    SciTech Connect (OSTI)

    Avdeyenkov, A.; Goriely, S.; Kamerdzhiev, S.; Tertychny, G.

    2009-01-28

    The radiative capture cross sections for the compound nuclei {sup 100}Sn, {sup 132}Sn and {sup 144}Nd have been calculated using both self-consistent and non-selfconsistent microscopic theories which, in addition to the standard RPA or QRPA approaches, take the single-particle continuum and phonon coupling into account. We show that the inclusion of the phonon coupling is necessary for a proper description of the pygmy resonance. Consequently, the radiative capture cross sections and corresponding rates are increased by a factor of 2-3 as compared with RPA or QRPA approaches. We conclude that the present approach provides a more complete and coherent description of the {gamma}-ray strength function than the previous models used so far and for astrophysics applications in particular, such calculations are highly recommended for a more reliable estimate of the electromagnetic properties of exotic nuclei.

  3. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    SciTech Connect (OSTI)

    Labuda, Aleksander; Proksch, Roger

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  4. In situ scanning tunneling microscope tip treatment device for spin polarization imaging

    DOE Patents [OSTI]

    Li, An-Ping [Oak Ridge, TN; Jianxing, Ma [Oak Ridge, TN; Shen, Jian [Knoxville, TN

    2008-04-22

    A tip treatment device for use in an ultrahigh vacuum in situ scanning tunneling microscope (STM). The device provides spin polarization functionality to new or existing variable temperature STM systems. The tip treatment device readily converts a conventional STM to a spin-polarized tip, and thereby converts a standard STM system into a spin-polarized STM system. The tip treatment device also has functions of tip cleaning and tip flashing a STM tip to high temperature (>2000.degree. C.) in an extremely localized fashion. Tip coating functions can also be carried out, providing the tip sharp end with monolayers of coating materials including magnetic films. The device is also fully compatible with ultrahigh vacuum sample transfer setups.

  5. Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope

    SciTech Connect (OSTI)

    Kuwahara, Masashi; Abe, Hidekazu; Tokumoto, Hiroshi; Shima, Takayuki; Tominaga, Junji; Fukuda, Hajime

    2004-03-15

    A carbon nanotube (CNT) was successfully attached to a base probe with a blunt apex and subsequently used as a probe for an atomic force microscope (AFM). This setup demonstrates high spatial resolution properties, plus an advantage: we were able to readily identify the loss of the CNT from the end of the probe by the resultant sudden drop in resolution. This design of probe is expected to feature yet another advantage: that of relative immunity to accidental collision compared to a CNT attached to a commercially available sharp tip. We also discuss the problems specific to CNT-attached probes, which are carbon contamination of the sample surface and artifact images formed at the edge of pit structures. We demonstrate that carbon contamination can be suppressed by a rubbing procedure before the scanning use, and that pit artifacts can be eliminated by optimizing the CNT length.

  6. Microscopic Insights into the Electrochemical Behavior of Non-aqueous Electrolytes in Supercapacitors

    SciTech Connect (OSTI)

    Jiang, Deen; Wu, Jianzhong

    2013-01-01

    Electric double-layer capacitors (EDLC) are electrical devices that store energy by adsorption of ionic species at the inner surface of porous electrodes. Compared with aqueous electrolytes, ionic liquid and organic electrolytes have the advantage of larger potential windows, making them attractive for the next generation of EDLC with superior energy and power densities. The performance of both ionic liquid and organic electrolyte EDLC hinges on the judicious selection of the electrode pore size and the electrolyte composition that requires a comprehension of the charging behavior from a microscopic view. In this perspective, we discuss predictions from the classical density functional theory (CDFT) on the dependence of the capacitance on the pore size for ionic-liquid and organic-electrolyte EDLC. CDFT is applicable to electrodes with the pore size ranging from that below the ionic dimensionality to mesoscopic scales, thus unique for investigating the electrochemical behavior of the confined electrolytes for EDLC applications.

  7. Note: Calibration of atomic force microscope cantilevers using only their resonant frequency and quality factor

    SciTech Connect (OSTI)

    Sader, John E.; Friend, James R.

    2014-11-15

    A simplified method for calibrating atomic force microscope cantilevers was recently proposed by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012); Sec. III D] that relies solely on the resonant frequency and quality factor of the cantilever in fluid (typically air). This method eliminates the need to measure the hydrodynamic function of the cantilever, which can be time consuming given the wide range of cantilevers now available. Using laser Doppler vibrometry, we rigorously assess the accuracy of this method for a series of commercially available cantilevers and explore its performance under non-ideal conditions. This shows that the simplified method is highly accurate and can be easily implemented to perform fast, robust, and non-invasive spring constant calibration.

  8. Microscopic modeling of mass and charge distributions in the spontaneous fission of 240Pu

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Sandhukhan, Jhilam; Nazarewicz, Witold; Schunck, Nicolas

    2016-01-20

    We propose a methodology to calculate microscopically the mass and charge distributions of spontaneous fission yields. We combine the multidimensional minimization of collective action for fission with stochastic Langevin dynamics to track the relevant fission paths from the ground-state configuration up to scission. The nuclear potential energy and collective inertia governing the tunneling motion are obtained with nuclear density functional theory in the collective space of shape deformations and pairing. As a result, we obtain a quantitative agreement with experimental data and find that both the charge and mass distributions in the spontaneous fission of 240Pu are sensitive both tomore » the dissipation in collective motion and to adiabatic fission characteristics.« less

  9. Hyperspectral microscope for in vivo imaging of microstructures and cells in tissues

    DOE Patents [OSTI]

    Demos; Stavros G.

    2011-05-17

    An optical hyperspectral/multimodal imaging method and apparatus is utilized to provide high signal sensitivity for implementation of various optical imaging approaches. Such a system utilizes long working distance microscope objectives so as to enable off-axis illumination of predetermined tissue thereby allowing for excitation at any optical wavelength, simplifies design, reduces required optical elements, significantly reduces spectral noise from the optical elements and allows for fast image acquisition enabling high quality imaging in-vivo. Such a technology provides a means of detecting disease at the single cell level such as cancer, precancer, ischemic, traumatic or other type of injury, infection, or other diseases or conditions causing alterations in cells and tissue micro structures.

  10. Apertureless scanning microscope probe as a detector of semiconductor laser emission

    SciTech Connect (OSTI)

    Dunaevskiy, Mikhail; Dontsov, Anton; Monakhov, Andrei; Alekseev, Prokhor; Titkov, Alexander; Baranov, Alexei; Girard, Paul; Arinero, Richard; Teissier, Roland

    2015-04-27

    An operating semiconductor laser has been studied using a scanning probe microscope. A shift of the resonance frequency of probe that is due to its heating by laser radiation has been analyzed. The observed shift is proportional to the absorbed radiation and can be used to measure the laser near field or its output power. A periodical dependence of the measured signal has been observed as a function of distance between the probe and the surface of the laser due to the interference of the outgoing and cantilever-reflected waves. Due to the multiple reflections resulting in the interference, the light absorption by the probe cantilever is greatly enhanced compared with a single pass case. Interaction of infrared emission of a diode laser with different probes has been studied.

  11. Laser apparatus and method for microscopic and spectroscopic analysis and processing of biological cells

    DOE Patents [OSTI]

    Gourley, P.L.; Gourley, M.F.

    1997-03-04

    An apparatus and method are disclosed for microscopic and spectroscopic analysis and processing of biological cells. The apparatus comprises a laser having an analysis region within the laser cavity for containing one or more biological cells to be analyzed. The presence of a cell within the analysis region in superposition with an activated portion of a gain medium of the laser acts to encode information about the cell upon the laser beam, the cell information being recoverable by an analysis means that preferably includes an array photodetector such as a CCD camera and a spectrometer. The apparatus and method may be used to analyze biomedical cells including blood cells and the like, and may include processing means for manipulating, sorting, or eradicating cells after analysis. 20 figs.

  12. Laser apparatus and method for microscopic and spectroscopic analysis and processing of biological cells

    DOE Patents [OSTI]

    Gourley, Paul L.; Gourley, Mark F.

    1997-01-01

    An apparatus and method for microscopic and spectroscopic analysis and processing of biological cells. The apparatus comprises a laser having an analysis region within the laser cavity for containing one or more biological cells to be analyzed. The presence of a cell within the analysis region in superposition with an activated portion of a gain medium of the laser acts to encode information about the cell upon the laser beam, the cell information being recoverable by an analysis means that preferably includes an array photodetector such as a CCD camera and a spectrometer. The apparatus and method may be used to analyze biomedical cells including blood cells and the like, and may include processing means for manipulating, sorting, or eradicating cells after analysis thereof.

  13. The effect of microscopic texture on the direct plasma surface passivation of Si solar cells

    SciTech Connect (OSTI)

    Mehrabian, S.; Xu, S.; Qaemi, A. A.; Shokri, B.; Chan, C. S.; Ostrikov, K.

    2013-04-15

    Textured silicon surfaces are widely used in manufacturing of solar cells due to increasing the light absorption probability and also the antireflection properties. However, these Si surfaces have a high density of surface defects that need to be passivated. In this study, the effect of the microscopic surface texture on the plasma surface passivation of solar cells is investigated. The movement of 10{sup 5} H{sup +} ions in the texture-modified plasma sheath is studied by Monte Carlo numerical simulation. The hydrogen ions are driven by the combined electric field of the plasma sheath and the textured surface. The ion dynamics is simulated, and the relative ion distribution over the textured substrate is presented. This distribution can be used to interpret the quality of the Si dangling bonds saturation and consequently, the direct plasma surface passivation.

  14. Mode-mismatched confocal thermal-lens microscope with collimated probe beam

    SciTech Connect (OSTI)

    Cabrera, Humberto; Korte, Dorota; Franko, Mladen

    2015-05-15

    We report a thermal lens microscope (TLM) based on an optimized mode-mismatched configuration. It takes advantage of the coaxial counter propagating tightly focused excitation and collimated probe beams, instead of both focused at the sample, as it is in currently known TLM setups. A simple mathematical model that takes into account the main features of the instrument is presented. The confocal detection scheme and the introduction of highly collimated probe beam allow enhancing the versatility, limit of detection (LOD), and sensitivity of the instrument. The theory is experimentally verified measuring ethanols absorption coefficient at 532.8 nm. Additionally, the presented technique is applied for detection of ultra-trace amounts of Cr(III) in liquid solution. The achieved LOD is 1.3 ppb, which represents 20-fold enhancement compared to transmission mode spectrometric techniques and a 7.5-fold improvement compared to previously reported methods for Cr(III) based on thermal lens effect.

  15. Fabrication of optical multilayer for two-color phase plate in super-resolution microscope

    SciTech Connect (OSTI)

    Iketaki, Yoshinori; Kitagawa, Katsuichi; Hidaka, Kohjiro; Kato, Naoki; Hirabayashi, Akira; Bokor, Nandor

    2014-07-15

    In super-resolution microscopy based on fluorescence depletion, the two-color phase plate (TPP) is an indispensable optical element, which can independently control the phase shifts for two beams of different color, i.e., the pump and erase beams. By controlling a phase shift of the erase beam through the TPP, the erase beam can be modulated into a doughnut shape, while the pump beam maintains the initial Gaussian shape. To obtain a reliable optical multiplayer (ML) for the TPP, we designed a ML with only two optical layers by performing numerical optimization. The measured phase shifts generated by the fabricated ML using interferometry correspond to the design values. The beam profiles in the focal plane are also consistent with theoretical results. Although the fabricated ML consists of only two optical layers, the ML can provide a suitable phase modulation function for the TPP in a practical super-resolution microscope.

  16. Laser interferometry force-feedback sensor for an interfacial force microscope

    DOE Patents [OSTI]

    Houston, Jack E.; Smith, William L.

    2004-04-13

    A scanning force microscope is provided with a force-feedback sensor to increase sensitivity and stability in determining interfacial forces between a probe and a sample. The sensor utilizes an interferometry technique that uses a collimated light beam directed onto a deflecting member, comprising a common plate suspended above capacitor electrodes situated on a substrate forming an interference cavity with a probe on the side of the common plate opposite the side suspended above capacitor electrodes. The probe interacts with the surface of the sample and the intensity of the reflected beam is measured and used to determine the change in displacement of the probe to the sample and to control the probe distance relative to the surface of the sample.

  17. Linear relationship between water wetting behavior and microscopic interactions of super-hydrophilic surfaces

    SciTech Connect (OSTI)

    Liu, Jian; Guo, Pan; University of Chinese Academy of Sciences, Beijing 100049 ; Wang, Chunlei; Shi, Guosheng Fang, Haiping

    2013-12-21

    Using molecular dynamics simulations, we show a fine linear relationship between surface energies and microscopic Lennard-Jones parameters of super-hydrophilic surfaces. The linear slope of the super-hydrophilic surfaces is consistent with the linear slope of the super-hydrophobic, hydrophobic, and hydrophilic surfaces where stable water droplets can stand, indicating that there is a universal linear behavior of the surface energies with the water-surface van der Waals interaction that extends from the super-hydrophobic to super-hydrophilic surfaces. Moreover, we find that the linear relationship exists for various substrate types, and the linear slopes of these different types of substrates are dependent on the surface atom density, i.e., higher surface atom densities correspond to larger linear slopes. These results enrich our understanding of water behavior on solid surfaces, especially the water wetting behaviors on uncharged super-hydrophilic metal surfaces.

  18. The future of electron microscopy

    SciTech Connect (OSTI)

    Zhu, Yimei; Durr, Hermann

    2015-04-01

    Seeing is believing. So goes the old adage and seen evidence is undoubtedly satisfying because it can be interpreted easily, though not always correctly. For centuries, humans have developed such instruments as telescopes that observe the heavens and microscopes that reveal bacteria and viruses. The 2014 Nobel Prize in Chemistry was awarded to Eric Betzig, Stefan Hell, and William Moerner for their foundational work on superresolution fluorescence microscopy in which they overcame the Abbe diffraction limit for the resolving power of conventional light microscopes. (See Physics Today, December 2014, page 18.) That breakthrough enabled discoveries in biological research and testifies to the importance of modern microscopy.

  19. The future of electron microscopy

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhu, Yimei; Durr, Hermann

    2015-04-01

    Seeing is believing. So goes the old adage and seen evidence is undoubtedly satisfying because it can be interpreted easily, though not always correctly. For centuries, humans have developed such instruments as telescopes that observe the heavens and microscopes that reveal bacteria and viruses. The 2014 Nobel Prize in Chemistry was awarded to Eric Betzig, Stefan Hell, and William Moerner for their foundational work on superresolution fluorescence microscopy in which they overcame the Abbe diffraction limit for the resolving power of conventional light microscopes. (See Physics Today, December 2014, page 18.) That breakthrough enabled discoveries in biological research and testifiesmore » to the importance of modern microscopy.« less

  20. Energy Storage & Power Electronics 2008 Peer Review - Power Electronic...

    Office of Environmental Management (EM)

    Power Electronics (PE) Systems Presentations Energy Storage & Power Electronics 2008 Peer ... Compact SiC-Based Power Converter System - Timothy Lin, Aegis.pdf (370.13 KB) ...

  1. Few Electron Quantum Dot coupling to Donor Implanted Electron...

    Office of Scientific and Technical Information (OSTI)

    Title: Few Electron Quantum Dot coupling to Donor Implanted Electron Spins. Abstract not provided. Authors: Rudolph, Martin ; Patrick Harvey-Collard ; Nielsen, Erik ; Gamble, John ...

  2. Uranium transport in Topopah Spring tuff: An ion-microscope investigation

    SciTech Connect (OSTI)

    McKeegan, K.D.; Phinney, D.; Oversby, V.M.; Buchholtz-ten Brink, M.; Smith, D.K.

    1988-10-01

    We investigated the effect of different methods of surface preparation on ion-microscope profiles of uranium concentration (added to the sample by diffusion from an aqueous solution) vs depth in a welded, devitrified, tuffaceous rock from Yucca Mountain. The concentration profiles were used to study transport of uranium in the tuff. Four wafers of rock were prepared from primary drill core material and finished by polishing with increasingly finer abrasive material. Final polishes were made with 400 grit SiC, 600 grit SiC, 0.3 um alumina, and 0.05 um alumina. The polished tuff wafers were exposed for eight hours to a solution of groundwater doped with 2 ppM 235-U. The wafers were then examined by SEM and the ion microscope was used to measure the lateral and depth distributions of 235-U and other isotopes in the wafer. No systematic correlation of the measured 235-U concentration- vs-depth profiles with the degree of surface finish was observed, indicating that the polishing does not affect the measurable transport of U in the tuff. A zone of enhanced 235-U concentration was observed in the upper few microns, which we attribute to sorption onto surfaces of exposed pores. Concentrations of 235-U were elevated above background to depths >15 um, indicating that rapid transport paths exist. When the uranium distribution near the surface of the wafer was modelled by an error function, an upper limit for a slower transport path was defined by an apparent diffusion coefficient of approximately 10{sup {minus}13} cm{sup 2}/s. 5 refs., 5 figs., 1 tab.

  3. Electromagnetic model for near-field microwave microscope with atomic resolution: Determination of tunnel junction impedance

    SciTech Connect (OSTI)

    Reznik, Alexander N.

    2014-08-25

    An electrodynamic model is proposed for the tunneling microwave microscope with subnanometer space resolution as developed by Lee et al. [Appl. Phys. Lett. 97, 183111 (2010)]. Tip-sample impedance Z{sub a} was introduced and studied in the tunneling and non-tunneling regimes. At tunneling breakdown, the microwave current between probe and sample flows along two parallel channels characterized by impedances Z{sub p} and Z{sub t} that add up to form overall impedance Z{sub a}. Quantity Z{sub p} is the capacitive impedance determined by the near field of the probe and Z{sub t} is the impedance of the tunnel junction. By taking into account the distance dependences of effective tip radius r{sub 0}(z) and tunnel resistance R{sub t}(z)?=?Re[Z{sub t}(z)], we were able to explain the experimentally observed dependences of resonance frequency f{sub r}(z) and quality factor Q{sub L}(z) of the microscope. The obtained microwave resistance R{sub t}(z) and direct current tunnel resistance R{sub t}{sup dc}(z) exhibit qualitatively similar behavior, although being largely different in both magnitude and the characteristic scale of height dependence. Interpretation of the microwave images of the atomic structure of test samples proved possible by taking into account the inductive component of tunnel impedance ImZ{sub t}?=??L{sub t}. Relation ?L{sub t}/R{sub t}???0.235 was obtained.

  4. Development of a detachable high speed miniature scanning probe microscope for large area substrates inspection

    SciTech Connect (OSTI)

    Sadeghian, Hamed E-mail: h.sadeghianmarnani@tudelft.nl; Herfst, Rodolf; Winters, Jasper; Crowcombe, Will; Kramer, Geerten; Dool, Teun van den; Es, Maarten H. van

    2015-11-15

    We have developed a high speed, miniature scanning probe microscope (MSPM) integrated with a Positioning Unit (PU) for accurately positioning the MSPM on a large substrate. This combination enables simultaneous, parallel operation of many units on a large sample for high throughput measurements. The size of the MSPM is 19 × 45 × 70 mm{sup 3}. It contains a one-dimensional flexure stage with counter-balanced actuation for vertical scanning with a bandwidth of 50 kHz and a z-travel range of more than 2 μm. This stage is mechanically decoupled from the rest of the MSPM by suspending it on specific dynamically determined points. The motion of the probe, which is mounted on top of the flexure stage is measured by a very compact optical beam deflection (OBD). Thermal noise spectrum measurements of short cantilevers show a bandwidth of 2 MHz and a noise of less than 15 fm/Hz{sup 1/2}. A fast approach and engagement of the probe to the substrate surface have been achieved by integrating a small stepper actuator and direct monitoring of the cantilever response to the approaching surface. The PU has the same width as the MSPM, 45 mm and can position the MSPM to a pre-chosen position within an area of 275×30 mm{sup 2} to within 100 nm accuracy within a few seconds. During scanning, the MSPM is detached from the PU which is essential to eliminate mechanical vibration and drift from the relatively low-resonance frequency and low-stiffness structure of the PU. Although the specific implementation of the MSPM we describe here has been developed as an atomic force microscope, the general architecture is applicable to any form of SPM. This high speed MSPM is now being used in a parallel SPM architecture for inspection and metrology of large samples such as semiconductor wafers and masks.

  5. On the microscopic fluctuations driving the NMR relaxation of quadrupolar ions in water

    SciTech Connect (OSTI)

    Carof, Antoine; Salanne, Mathieu; Rotenberg, Benjamin; Charpentier, Thibault

    2015-11-21

    Nuclear Magnetic Resonance (NMR) relaxation is sensitive to the local structure and dynamics around the probed nuclei. The Electric Field Gradient (EFG) is the key microscopic quantity to understand the NMR relaxation of quadrupolar ions, such as {sup 7}Li{sup +}, {sup 23}Na{sup +}, {sup 25}Mg{sup 2+}, {sup 35}Cl{sup −}, {sup 39}K{sup +}, or {sup 133}Cs{sup +}. Using molecular dynamics simulations, we investigate the statistical and dynamical properties of the EFG experienced by alkaline, alkaline Earth, and chloride ions at infinite dilution in water. Specifically, we analyze the effect of the ionic charge and size on the distribution of the EFG tensor and on the multi-step decay of its auto-correlation function. The main contribution to the NMR relaxation time arises from the slowest mode, with a characteristic time on the picosecond time scale. The first solvation shell of the ion plays a dominant role in the fluctuations of the EFG, all the more that the ion radius is small and its charge is large. We propose an analysis based on a simplified charge distribution around the ion, which demonstrates that the auto-correlation of the EFG, hence the NMR relaxation time, reflects primarily the collective translational motion of water molecules in the first solvation shell of the cations. Our findings provide a microscopic route to the quantitative interpretation of NMR relaxation measurements and open the way to the design of improved analytical theories for NMR relaxation for small ionic solutes, which should focus on water density fluctuations around the ion.

  6. Plasmonic behavior of gold nanorod heterodimers with free-electron feed

    SciTech Connect (OSTI)

    Maiti, Arpan; Maity, Achyut; Chini, Tapas Kumar

    2015-06-24

    The plasmon coupling between metal nanostructures can lead to huge local electric field enhancement and new plasmon modes. Here, we study the effect of the close proximity of two gold nanorod particles on the modification of localized surface plasmon (LSP) modes of the individual on gold nanorod in spectral and spatial domain using cathodoluminescence (CL) spectroscopy and imaging in a high resolution scanning electron microscope (SEM). Significantly enhanced resonant emission is observed from the nanorod dimers when the electron beam is injected around the junction between the rods, where the local density of electromagnetic states is raised.

  7. Electron tunnelling through single azurin molecules can be on/off switched by voltage pulses

    SciTech Connect (OSTI)

    Baldacchini, Chiara; Kumar, Vivek; Bizzarri, Anna Rita; Cannistraro, Salvatore

    2015-05-04

    Redox metalloproteins are emerging as promising candidates for future bio-optoelectronic and nano-biomemory devices, and the control of their electron transfer properties through external signals is still a crucial task. Here, we show that a reversible on/off switching of the electron current tunnelling through a single protein can be achieved in azurin protein molecules adsorbed on gold surfaces, by applying appropriate voltage pulses through a scanning tunnelling microscope tip. The observed changes in the hybrid system tunnelling properties are discussed in terms of long-sustained charging of the protein milieu.

  8. Cooling system for electronic components

    DOE Patents [OSTI]

    Anderl, William James; Colgan, Evan George; Gerken, James Dorance; Marroquin, Christopher Michael; Tian, Shurong

    2015-12-15

    Embodiments of the present invention provide for non interruptive fluid cooling of an electronic enclosure. One or more electronic component packages may be removable from a circuit card having a fluid flow system. When installed, the electronic component packages are coincident to and in a thermal relationship with the fluid flow system. If a particular electronic component package becomes non-functional, it may be removed from the electronic enclosure without affecting either the fluid flow system or other neighboring electronic component packages.

  9. Gold nanoparticles formed directly on a membrane by ultraviolet light irradiation

    SciTech Connect (OSTI)

    Qian, Hui Chen, Jian; Shen, Wei-Zheng; Kawasaki, Masahiro; Egerton, Ray F.

    2015-06-08

    There have been numerous research efforts directed towards the synthesis of gold (Au) nanoparticles (NPs) and the understanding of their formation, so that their size, shape, and stability can be well controlled for desired applications. Here, we report a dry photo-reduced method of Au NP formation directly on a membrane, such as a carbon thin film or a quartz slide. The evolution of Au NP formation was revealed by ex-situ experiments in an aberration-corrected scanning transmission electron microscope. The membranes were immersed in Au{sup 3+} solution before being taken out and quickly dried in ambient air at room temperature, then irradiated with ultraviolet (UV) light with wavelengths of 189 nm and 254 nm in a low-pressure chamber. The results show that Au{sup 3+} ions and ion clusters self-assembled on the membrane surface before UV irradiation and that solid Au NPs with sizes of 3 nm–12 nm were formed after UV irradiation. Annealing at 40 °C for about 30 min helped to further stabilize the nanoparticles. The Au NPs were uniform and well dispersed, and should find applications in the electron microscopy field, for example.

  10. Circular free-electron laser

    DOE Patents [OSTI]

    Brau, Charles A.; Kurnit, Norman A.; Cooper, Richard K.

    1984-01-01

    A high efficiency, free electron laser utilizing a circular relativistic electron beam accelerator and a circular whispering mode optical waveguide for guiding optical energy in a circular path in the circular relativistic electron beam accelerator such that the circular relativistic electron beam and the optical energy are spatially contiguous in a resonant condition for free electron laser operation. Both a betatron and synchrotron are disclosed for use in the present invention. A free electron laser wiggler is disposed around the circular relativistic electron beam accelerator for generating a periodic magnetic field to transform energy from the circular relativistic electron beam to optical energy.

  11. Tokyo Electron | Open Energy Information

    Open Energy Info (EERE)

    Electron Jump to: navigation, search Name: Tokyo Electron Place: Tokyo, Tokyo, Japan Zip: 107-8481 Product: As a leading global supplier of semiconductor production equipment,...

  12. Tim Kuneli, Electronics Maintenance Group

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Tim Kuneli, Electronics Maintenance Group Print The recent ALS power supply failure was one of the most challenging projects that Electronics Engineer Technical Superintendent Tim...

  13. Manasa Electronics | Open Energy Information

    Open Energy Info (EERE)

    Manasa Electronics Jump to: navigation, search Name: Manasa Electronics Place: Ghaziabad, Uttar Pradesh, India Zip: 201 005 Sector: Solar Product: Ghaziabad-based manufacturer of...

  14. Electron Trapping by Molecular Vibration

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Trapping by Molecular Vibration Print In photoelectron spectroscopy experiments performed at the ALS, a group of researchers has found that electronic transitions normally...

  15. Superconducting qubit as a quantum transformer routing entanglement between a microscopic quantum memory and a macroscopic resonator

    SciTech Connect (OSTI)

    Kemp, Alexander; Saito, Shiro; Semba, Kouichi [NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya Atsugi-shi, Kanagawa 243-0198 (Japan); Munro, William J. [NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya Atsugi-shi, Kanagawa 243-0198 (Japan); National Institute of Informatics 2-1-2 Hitotsubashi, Chiyoda ku, Tokyo 101-8430 (Japan); Nemoto, Kae [National Institute of Informatics 2-1-2 Hitotsubashi, Chiyoda ku, Tokyo 101-8430 (Japan)

    2011-09-01

    We demonstrate experimentally the creation and measurement of an entangled state between a microscopic two-level system (TLS), formed by a defect in an oxide layer, and a macroscopic superconducting resonator, where their indirect interaction is mediated by an artificial atom, a superconducting persistent current qubit (PCQB). Under appropriate conditions, we found the coherence time of the TLS, the resonator, and the entangled state of these two are significantly longer than the Ramsey dephasing time of PCQB itself. This demonstrates that a PCQB can be used as a quantum transformer to address high coherence microscopic quantum memories by connecting them to macroscopic quantum buses.

  16. Foil Electron Multiplier

    DOE Patents [OSTI]

    Funsten, Herbert O.; Baldonado, Juan R.; Dors, Eric E.; Harper, Ronnie W.; Skoug, Ruth M.

    2006-03-28

    An apparatus for electron multiplication by transmission that is designed with at least one foil having a front side for receiving incident particles and a back side for transmitting secondary electrons that are produced from the incident particles transiting through the foil. The foil thickness enables the incident particles to travel through the foil and continue on to an anode or to a next foil in series with the first foil. The foil, or foils, and anode are contained within a supporting structure that is attached within an evacuated enclosure. An electrical power supply is connected to the foil, or foils, and the anode to provide an electrical field gradient effective to accelerate negatively charged incident particles and the generated secondary electrons through the foil, or foils, to the anode for collection.

  17. ELECTRON EMISSION REGULATING MEANS

    DOE Patents [OSTI]

    Brenholdt, I.R.

    1957-11-19

    >An electronic regulating system is described for controlling the electron emission of a cathode, for example, the cathode in a mass spectrometer. The system incorporates a transformer having a first secondary winding for the above-mentioned cathode and a second secondary winding for the above-mentioned cathode and a second secondary winding load by grid controlled vacuum tubes. A portion of the electron current emitted by the cathode is passed through a network which develops a feedback signal. The system arrangement is completed by using the feedback signal to control the vacuum tubes in the second secondary winding through a regulator tube. When a change in cathode emission occurs, the feedback signal acts to correct this change by adjusting the load on the transformer.

  18. Electron launching voltage monitor

    DOE Patents [OSTI]

    Mendel, C.W.; Savage, M.E.

    1992-03-17

    An electron launching voltage monitor measures MITL voltage using a relationship between anode electric field and electron current launched from a cathode-mounted perturbation. An electron launching probe extends through and is spaced from the edge of an opening in a first MITL conductor, one end of the launching probe being in the gap between the MITL conductor, the other end being adjacent a first side of the first conductor away from the second conductor. A housing surrounds the launching probe and electrically connects the first side of the first conductor to the other end of the launching probe. A detector detects the current passing through the housing to the launching probe, the detected current being representative of the voltage between the conductors. 5 figs.

  19. Electron launching voltage monitor

    DOE Patents [OSTI]

    Mendel, Clifford W.; Savage, Mark E.

    1992-01-01

    An electron launching voltage monitor measures MITL voltage using a relationship between anode electric field and electron current launched from a cathode-mounted perturbation. An electron launching probe extends through and is spaced from the edge of an opening in a first MITL conductor, one end of the launching probe being in the gap between the MITL conductor, the other end being adjacent a first side of the first conductor away from the second conductor. A housing surrounds the launching probe and electrically connects the first side of the first conductor to the other end of the launching probe. A detector detects the current passing through the housing to the launching probe, the detected current being representative of the voltage between the conductors.

  20. Precision electron polarimetry

    SciTech Connect (OSTI)

    Chudakov, Eugene A.

    2013-11-01

    A new generation of precise Parity-Violating experiments will require a sub-percent accuracy of electron beam polarimetry. Compton polarimetry can provide such accuracy at high energies, but at a few hundred MeV the small analyzing power limits the sensitivity. M{\\o}ller polarimetry provides a high analyzing power independent on the beam energy, but is limited by the properties of the polarized targets commonly used. Options for precision polarimetry at ~300 MeV will be discussed, in particular a proposal to use ultra-cold atomic hydrogen traps to provide a 100\\%-polarized electron target for M{\\o}ller polarimetry.

  1. Electronic Recordkeeping System Questionnaire

    Energy Savers [EERE]

    Electronic Docket Room (e-Docket Room) Electronic Docket Room (e-Docket Room) E-Docket -- Browse Searchable Database of Current and Historical Applications Submitted to DOE (click SHOW for drop down menu) Authorizations/Orders Granted by the Department -- NOTE: 1977 thru 2016 will take you to an external link. 1977 1978 1979 1980 1981 1982 1983 1984 1985 1986 1987 1988 1989 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013

  2. A large hadron electron collider at CERN

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Abelleira Fernandez, J. L.

    2015-04-06

    This document provides a brief overview of the recently published report on the design of the Large Hadron Electron Collider (LHeC), which comprises its physics programme, accelerator physics, technology and main detector concepts. The LHeC exploits and develops challenging, though principally existing, accelerator and detector technologies. This summary is complemented by brief illustrations of some of the highlights of the physics programme, which relies on a vastly extended kinematic range, luminosity and unprecedented precision in deep inelastic scattering. Illustrations are provided regarding high precision QCD, new physics (Higgs, SUSY) and eletron-ion physics. The LHeC is designed to run synchronously withmore » the LHC in the twenties and to achieve an integrated luminosity of O(100)fb–1. It will become the cleanest high resolution microscope of mankind and will substantially extend as well as complement the investigation of the physics of the TeV energy scale, which has been enabled by the LHC.« less

  3. A large hadron electron collider at CERN

    SciTech Connect (OSTI)

    Abelleira Fernandez, J. L.

    2015-04-06

    This document provides a brief overview of the recently published report on the design of the Large Hadron Electron Collider (LHeC), which comprises its physics programme, accelerator physics, technology and main detector concepts. The LHeC exploits and develops challenging, though principally existing, accelerator and detector technologies. This summary is complemented by brief illustrations of some of the highlights of the physics programme, which relies on a vastly extended kinematic range, luminosity and unprecedented precision in deep inelastic scattering. Illustrations are provided regarding high precision QCD, new physics (Higgs, SUSY) and eletron-ion physics. The LHeC is designed to run synchronously with the LHC in the twenties and to achieve an integrated luminosity of O(100)fb1. It will become the cleanest high resolution microscope of mankind and will substantially extend as well as complement the investigation of the physics of the TeV energy scale, which has been enabled by the LHC.

  4. A large hadron electron collider at CERN

    SciTech Connect (OSTI)

    Abelleira Fernandez, J. L.

    2015-04-06

    This document provides a brief overview of the recently published report on the design of the Large Hadron Electron Collider (LHeC), which comprises its physics programme, accelerator physics, technology and main detector concepts. The LHeC exploits and develops challenging, though principally existing, accelerator and detector technologies. This summary is complemented by brief illustrations of some of the highlights of the physics programme, which relies on a vastly extended kinematic range, luminosity and unprecedented precision in deep inelastic scattering. Illustrations are provided regarding high precision QCD, new physics (Higgs, SUSY) and eletron-ion physics. The LHeC is designed to run synchronously with the LHC in the twenties and to achieve an integrated luminosity of O(100)fb–1. It will become the cleanest high resolution microscope of mankind and will substantially extend as well as complement the investigation of the physics of the TeV energy scale, which has been enabled by the LHC.

  5. Precision shape modification of nanodevices with a low-energy electron beam

    DOE Patents [OSTI]

    Zettl, Alex; Yuzvinsky, Thomas David; Fennimore, Adam

    2010-03-09

    Methods of shape modifying a nanodevice by contacting it with a low-energy focused electron beam are disclosed here. In one embodiment, a nanodevice may be permanently reformed to a different geometry through an application of a deforming force and a low-energy focused electron beam. With the addition of an assist gas, material may be removed from the nanodevice through application of the low-energy focused electron beam. The independent methods of shape modification and material removal may be used either individually or simultaneously. Precision cuts with accuracies as high as 10 nm may be achieved through the use of precision low-energy Scanning Electron Microscope scan beams. These methods may be used in an automated system to produce nanodevices of very precise dimensions. These methods may be used to produce nanodevices of carbon-based, silicon-based, or other compositions by varying the assist gas.

  6. Reversible Hydrogen Storage Materials – Structure, Chemistry, and Electronic Structure

    SciTech Connect (OSTI)

    Robertson, Ian M.; Johnson, Duane D.

    2014-06-21

    To understand the processes involved in the uptake and release of hydrogen from candidate light-weight metal hydride storage systems, a combination of materials characterization techniques and first principle calculation methods have been employed. In addition to conventional microstructural characterization in the transmission electron microscope, which provides projected information about the through thickness microstructure, electron tomography methods were employed to determine the three-dimensional spatial distribution of catalyst species for select systems both before and after dehydrogenation. Catalyst species identification as well as compositional analysis of the storage material before and after hydrogen charging and discharging was performed using a combination of energy dispersive spectroscopy, EDS, and electron energy loss spectroscopy, EELS. The characterization effort was coupled with first-principles, electronic-structure and thermodynamic techniques to predict and assess meta-stable and stable phases, reaction pathways, and thermodynamic and kinetic barriers. Systems studied included:NaAlH4, CaH2/CaB6 and Ca(BH4)2, MgH2/MgB2, Ni-Catalyzed Magnesium Hydride, TiH2-Catalyzed Magnesium Hydride, LiBH4, Aluminum-based systems and Aluminum

  7. Electronic Coupling Dependence of Ultrafast Interfacial Electron Transfer

    Office of Scientific and Technical Information (OSTI)

    on Nanocrystalline Thin Films and Single Crystal (Technical Report) | SciTech Connect Electronic Coupling Dependence of Ultrafast Interfacial Electron Transfer on Nanocrystalline Thin Films and Single Crystal Citation Details In-Document Search Title: Electronic Coupling Dependence of Ultrafast Interfacial Electron Transfer on Nanocrystalline Thin Films and Single Crystal The long-term goal of the proposed research is to understand electron transfer dynamics in nanoparticle/liquid interface.

  8. Electron correlation effects on the magnetostructural transition...

    Office of Scientific and Technical Information (OSTI)

    Country of Publication: United States Language: English Subject: 75 CONDENSED MATTER ... ELECTRON CORRELATION; ELECTRONIC STRUCTURE; ELECTRONS; ENTROPY; EXCHANGE ...

  9. MEIC electron cooling program

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Derbenev, Yaroslav S.; Zhang, Yuhong

    2014-12-01

    Cooling of proton and ion beams is essential for achieving high luminosities (up to above 1034 cm-2s-1) for MEIC, a Medium energy Electron-Ion Collider envisioned at JLab [1] for advanced nuclear science research. In the present conceptual design, we utilize the conventional election cooling method and adopted a multi-staged cooling scheme for reduction of and maintaining low beam emittances [2,3,4]. Two electron cooling facilities are required to support the scheme: one is a low energy (up to 2 MeV) DC cooler installed in the MEIC ion pre-booster (with the proton kinetic energy up to 3 GeV); the other is amore » high electron energy (up to 55 MeV) cooler in the collider ring (with the proton kinetic energy from 25 to 100 GeV). The high energy cooler, which is based on the ERL technology and a circulator ring, utilizes a bunched electron beam to cool bunched proton or ion beams. To complete the MEIC cooling concept and a technical design of the ERL cooler as well as to develop supporting technologies, an R&D program has been initiated at Jefferson Lab and significant progresses have been made since then. In this study, we present a brief description of the cooler design and a summary of the progress in this cooling R&D.« less

  10. Electron beam cutting

    DOE Patents [OSTI]

    Mochel, M.E.; Humphreys, C.J.

    1985-04-02

    A method for the cutting of holes 20 Angstroms in diameter, or lines 20 Angstroms wide in a material having positive ionic conduction by the use of a focused electron probe is described. The holes and lines are stable under ambient conditions. 2 figs.

  11. ELECTRONIC DIGITAL COMPUTER

    DOE Patents [OSTI]

    Stone, J.J. Jr.; Bettis, E.S.; Mann, E.R.

    1957-10-01

    The electronic digital computer is designed to solve systems involving a plurality of simultaneous linear equations. The computer can solve a system which converges rather rapidly when using Von Seidel's method of approximation and performs the summations required for solving for the unknown terms by a method of successive approximations.

  12. Electron beam cutting

    DOE Patents [OSTI]

    Mochel, Margaret E.; Humphreys, Colin J.

    1985-04-02

    A method for the cutting of holes 20 Angstroms in diameter, or lines 20 Angstroms wide in a material having positive ionic conduction by the use of a focused electron probe is described. The holes and lines are stable under ambient conditions.

  13. WETTABILITY AND IMBIBITION: MICROSCOPIC DISTRIBUTION OF WETTING AND ITS CONSEQUENCES AT THE CORE AND FIELD SCALES

    SciTech Connect (OSTI)

    Jill S. Buckley; Norman R. Morrow; Chris Palmer; Purnendu K. Dasgupta

    2003-02-01

    The questions of reservoir wettability have been approached in this project from three directions. First, we have studied the properties of crude oils that contribute to wetting alteration in a reservoir. A database of more than 150 different crude oil samples has been established to facilitate examination of the relationships between crude oil chemical and physical properties and their influence on reservoir wetting. In the course of this work an improved SARA analysis technique was developed and major advances were made in understanding asphaltene stability including development of a thermodynamic Asphaltene Solubility Model (ASM) and empirical methods for predicting the onset of instability. The CO-Wet database is a resource that will be used to guide wettability research in the future. The second approach is to study crude oil/brine/rock interactions on smooth surfaces. Contact angle measurements were made under controlled conditions on mica surfaces that had been exposed to many of the oils in the CO-Wet database. With this wealth of data, statistical tests can now be used to examine the relationships between crude oil properties and the tendencies of those oils to alter wetting. Traditionally, contact angles have been used as the primary wetting assessment tool on smooth surfaces. A new technique has been developed using an atomic forces microscope that adds a new dimension to the ability to characterize oil-treated surfaces. Ultimately we aim to understand wetting in porous media, the focus of the third approach taken in this project. Using oils from the CO-Wet database, experimental advances have been made in scaling the rate of imbibition, a sensitive measure of core wetting. Application of the scaling group to mixed-wet systems has been demonstrated for a range of core conditions. Investigations of imbibition in gas/liquid systems provided the motivation for theoretical advances as well. As a result of this project we have many new tools for studying

  14. Microscopic model for intersubband gain from electrically pumped quantum-dot structures

    SciTech Connect (OSTI)

    Michael, Stephan; Chow, Weng Wah; Schneider, Han Christian

    2014-10-03

    We study theoretically the performance of electrically pumped self-organized quantum dots as a gain material in the mid-infrared range at room temperature. We analyze an AlGaAs/InGaAs based structure composed of dots-in-a-well sandwiched between two quantum wells. We numerically analyze a comprehensive model by combining a many-particle approach for electronic dynamics with a realistic modeling of the electronic states in the whole structure. We investigate the gain both for quasi-equilibrium conditions and current injection. We find, comparing different structures, that steady-state gain can only be realized by an efficient extraction process, which prevents an accumulation of electrons in continuum states, that make the available scattering pathways through the quantum-dot active region too fast to sustain inversion.

  15. Microscopic model for intersubband gain from electrically pumped quantum-dot structures

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Michael, Stephan; Chow, Weng Wah; Schneider, Han Christian

    2014-10-03

    We study theoretically the performance of electrically pumped self-organized quantum dots as a gain material in the mid-infrared range at room temperature. We analyze an AlGaAs/InGaAs based structure composed of dots-in-a-well sandwiched between two quantum wells. We numerically analyze a comprehensive model by combining a many-particle approach for electronic dynamics with a realistic modeling of the electronic states in the whole structure. We investigate the gain both for quasi-equilibrium conditions and current injection. We find, comparing different structures, that steady-state gain can only be realized by an efficient extraction process, which prevents an accumulation of electrons in continuum states, thatmore » make the available scattering pathways through the quantum-dot active region too fast to sustain inversion.« less

  16. Sandia National Laboratories: Power Electronics

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Power Electronics Sensors Power electronics is the application of solid-state electronics for routing, control, and conversion of electrical power. Custom Solutions Wide-Bandgap Wide-bandgap semiconductor materials such as silicon carbide (SiC) and gallium nitride (GaN) have the potential to revolutionize the field of power electronics. Sandia National Laboratories is well-suited to understand both performance and reliability in wide-bandgap power electronics. Understanding Material Properties

  17. Diamondoid monolayers as electron emitters

    DOE Patents [OSTI]

    Yang, Wanli; Fabbri, Jason D.; Melosh, Nicholas A.; Hussain, Zahid; Shen, Zhi-Xun

    2013-10-29

    Provided are electron emitters based upon diamondoid monolayers, preferably self-assembled higher diamondoid monolayers. High intensity electron emission has been demonstrated employing such diamondoid monolayers, particularly when the monolayers are comprised of higher diamondoids. The application of such diamondoid monolayers can alter the band structure of substrates, as well as emit monochromatic electrons, and the high intensity electron emissions can also greatly improve the efficiency of field-effect electron emitters as applied to industrial and commercial applications.

  18. Diamondoid monolayers as electron emitters

    DOE Patents [OSTI]

    Yang, Wanli; Fabbri, Jason D.; Melosh, Nicholas A.; Hussain, Zahid; Shen, Zhi-Xun

    2012-04-10

    Provided are electron emitters based upon diamondoid monolayers, preferably self-assembled higher diamondoid monolayers. High intensity electron emission has been demonstrated employing such diamondoid monolayers, particularly when the monolayers are comprised of higher diamondoids. The application of such diamondoid monolayers can alter the band structure of substrates, as well as emit monochromatic electrons, and the high intensity electron emissions can also greatly improve the efficiency of field-effect electron emitters as applied to industrial and commercial applications.

  19. Microscopic model of electric-field-noise heating in ion traps

    SciTech Connect (OSTI)

    Safavi-Naini, A.; Rabl, P.; Weck, P. F.; Sadeghpour, H. R.

    2011-08-15

    Motional heating of ions in microfabricated traps is one of the open challenges hindering experimental realizations of large-scale quantum processing devices. Recently, a series of measurements of the heating rates in surface-electrode ion traps characterized their frequency, distance, and temperature dependencies, but our understanding of the microscopic origin of this noise remains incomplete. In this work we develop a theoretical model for the electric field noise which is associated with a random distribution of adsorbed atoms on the trap electrode surface. By using first-principles calculations of the fluctuating dipole moments of the adsorbed atoms we evaluate the distance, frequency, and temperature dependence of the resulting electric field fluctuation spectrum. Our theory reproduces correctly the d{sup -4} dependence with distance of the ion from the electrode surface and calculates the noise spectrum beyond the standard scenario of two-level fluctuators by incorporating all the relevant vibrational states. Our model predicts a regime of 1/f noise which commences at roughly the frequency of the fundamental phonon transition rate and a thermally activated noise spectrum which for higher temperatures exhibits a crossover as a function of frequency.

  20. Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

    SciTech Connect (OSTI)

    Evans, J. Chapman, S.

    2014-08-14

    Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided.

  1. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    SciTech Connect (OSTI)

    Long, Christian J.; Cannara, Rachel J.

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  2. Microscopic description of anisotropic low-density dipolar Bose gases in two dimensions

    SciTech Connect (OSTI)

    Macia, A.; Mazzanti, F.; Boronat, J.; Zillich, R. E.

    2011-09-15

    A microscopic description of the zero-energy two-body ground state and many-body static properties of anisotropic homogeneous gases of bosonic dipoles in two dimensions at low densities is presented and discussed. By changing the polarization angle with respect to the plane, we study the impact of the anisotropy, present in the dipole-dipole interaction, on the energy per particle, comparing the results with mean-field predictions. We restrict the analysis to the regime where the interaction is always repulsive, although the strength of the repulsion depends on the orientation with respect to the polarization field. We present a series expansion of the solution of the zero-energy two-body problem, which allows us to find the scattering length of the interaction and to build a suitable Jastrow factor that we use as a trial wave function for both a variational and diffusion Monte Carlo simulation of the infinite system. We find that the anisotropy has an almost negligible impact on the ground-state properties of the many-body system in the universal regime where the scattering length governs the physics of the system. We also show that scaling in the gas parameter persists in the dipolar case up to values where other isotropic interactions with the same scattering length yield different predictions.

  3. Microscopic heavy-ion theory. Final Report. February 2014-June 2015

    SciTech Connect (OSTI)

    Ernst, David J.; Oberacker, Volker E.; Umar, A. Sait

    2015-06-30

    The Vanderbilt nuclear theory group conducts research in the areas of low-energy nuclear reactions and in neutrino oscillations. Specically, we study dynamics of nuclear reactions microscopically, in particular for neutron-rich nuclei which will be accessible with current and future radioactive ion beam facilities. The neutrino work concentrates on constructing computational tools for analyzing neutrino oscillation data. The most important of these is the analysis of the Super K atmospheric data. Our research concentrates on the following topics which are part of the DOE Long-Range Plan: STUDIES OF LOW-ENERGY REACTIONS OF EXOTIC NUCLEI (Professors Umar and Oberacker), including sub-barrier fusion cross sections, capture cross sections for superheavy element production, and nuclear astrophysics applications. Our theory project is strongly connected to experiments at RIB facilities around the world, including NSCL-FRIB (MSU) and ATLAS-CARIBU (Argonne). PHENOMENOLOGY OF NEUTRINO OSCILLATIONS (Prof. Ernst), extracting information from existing neutrino oscillation experiments and proposing possible future experiments in order to better understand the oscillation phenomenon.

  4. High-speed atomic force microscope based on an astigmatic detection system

    SciTech Connect (OSTI)

    Liao, H.-S.; Chen, Y.-H.; Hwu, E.-T.; Chang, C.-S.; Hwang, I.-S.; Ding, R.-F.; Huang, H.-F.; Wang, W.-M.; Huang, K.-Y.

    2014-10-15

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  5. On the correlation between microscopic structural heterogeneity and embrittlement behavior in metallic glasses

    SciTech Connect (OSTI)

    Li, Weidong; Gao, Yanfei; Bei, Hongbin

    2015-10-05

    To establish a relationship between microstructure and mechanical properties, we systematically annealed a Zr-based bulk metallic glass (BMG) at 100 ~ 300°C and measured their mechanical and thermal properties. The as-cast BMG exhibits some ductility, while the increase of annealing temperature and time leads to the transition to a brittle behavior that can reach nearly-zero fracture energy. The differential scanning calorimetry did not find any significant changes in crystallization temperature and enthalpy, indicating that the materials still remained fully amorphous. Elastic constants measured by ultrasonic technique vary only slightly with respect to annealing temperature and time, which does obey the empirical relationship between Poisson’s ratio and fracture behavior. Nanoindentation pop-in tests were conducted, from which the pop-in strength mapping provides a “mechanical probe” of the microscopic structural heterogeneities in these metallic glasses. Based on stochastically statistic defect model, we found that the defect density decreases with increasing annealing temperature and annealing time and is exponentially related to the fracture energy. A ductile-versus-brittle behavior (DBB) model based on the structural heterogeneity is developed to identify the physical origins of the embrittlement behavior through the interactions between these defects and crack tip.

  6. Optical microscope using an interferometric source of two-color, two-beam entangled photons

    DOE Patents [OSTI]

    Dress, William B.; Kisner, Roger A.; Richards, Roger K.

    2004-07-13

    Systems and methods are described for an optical microscope using an interferometric source of multi-color, multi-beam entangled photons. A method includes: downconverting a beam of coherent energy to provide a beam of multi-color entangled photons; converging two spatially resolved portions of the beam of multi-color entangled photons into a converged multi-color entangled photon beam; transforming at least a portion of the converged multi-color entangled photon beam by interaction with a sample to generate an entangled photon specimen beam; and combining the entangled photon specimen beam with an entangled photon reference beam within a single beamsplitter. An apparatus includes: a multi-refringent device providing a beam of multi-color entangled photons; a condenser device optically coupled to the multi-refringent device, the condenser device converging two spatially resolved portions of the beam of multi-color entangled photons into a converged multi-color entangled photon beam; a beam probe director and specimen assembly optically coupled to the condenser device; and a beam splitter optically coupled to the beam probe director and specimen assembly, the beam splitter combining an entangled photon specimen beam from the beam probe director and specimen assembly with an entangled photon reference beam.

  7. On the correlation between microscopic structural heterogeneity and embrittlement behavior in metallic glasses

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Li, Weidong; Gao, Yanfei; Bei, Hongbin

    2015-10-05

    To establish a relationship between microstructure and mechanical properties, we systematically annealed a Zr-based bulk metallic glass (BMG) at 100 ~ 300°C and measured their mechanical and thermal properties. The as-cast BMG exhibits some ductility, while the increase of annealing temperature and time leads to the transition to a brittle behavior that can reach nearly-zero fracture energy. The differential scanning calorimetry did not find any significant changes in crystallization temperature and enthalpy, indicating that the materials still remained fully amorphous. Elastic constants measured by ultrasonic technique vary only slightly with respect to annealing temperature and time, which does obey themore » empirical relationship between Poisson’s ratio and fracture behavior. Nanoindentation pop-in tests were conducted, from which the pop-in strength mapping provides a “mechanical probe” of the microscopic structural heterogeneities in these metallic glasses. Based on stochastically statistic defect model, we found that the defect density decreases with increasing annealing temperature and annealing time and is exponentially related to the fracture energy. A ductile-versus-brittle behavior (DBB) model based on the structural heterogeneity is developed to identify the physical origins of the embrittlement behavior through the interactions between these defects and crack tip.« less

  8. The effect of electron-electron interaction induced dephasing on electronic transport in graphene nanoribbons

    SciTech Connect (OSTI)

    Kahnoj, Sina Soleimani; Touski, Shoeib Babaee; Pourfath, Mahdi E-mail: pourfath@iue.tuwien.ac.at

    2014-09-08

    The effect of dephasing induced by electron-electron interaction on electronic transport in graphene nanoribbons is theoretically investigated. In the presence of disorder in graphene nanoribbons, wavefunction of electrons can set up standing waves along the channel and the conductance exponentially decreases with the ribbon's length. Employing the non-equilibrium Green's function formalism along with an accurate model for describing the dephasing induced by electron-electron interaction, we show that this kind of interaction prevents localization and transport of electrons remains in the diffusive regime where the conductance is inversely proportional to the ribbon's length.

  9. Dynamic Transmission Electron Microscopy

    SciTech Connect (OSTI)

    Evans, James E.; Jungjohann, K. L.; Browning, Nigel D.

    2012-10-12

    Dynamic transmission electron microscopy (DTEM) combines the benefits of high spatial resolution electron microscopy with the high temporal resolution of ultrafast lasers. The incorporation of these two components into a single instrument provides a perfect platform for in situ observations of material processes. However, previous DTEM applications have focused on observing structural changes occurring in samples exposed to high vacuum. Therefore, in order to expand the pump-probe experimental regime to more natural environmental conditions, in situ gas and liquid chambers must be coupled with Dynamic TEM. This chapter describes the current and future applications of in situ liquid DTEM to permit time-resolved atomic scale observations in an aqueous environment, Although this chapter focuses mostly on in situ liquid imaging, the same research potential exists for in situ gas experiments and the successful integration of these techniques promises new insights for understanding nanoparticle, catalyst and biological protein dynamics with unprecedented spatiotemporal resolution.

  10. ELECTRONIC PHASE CONTROL CIRCUIT

    DOE Patents [OSTI]

    Salisbury, J.D.; Klein, W.W.; Hansen, C.F.

    1959-04-21

    An electronic circuit is described for controlling the phase of radio frequency energy applied to a multicavity linear accelerator. In one application of the circuit two cavities are excited from a single radio frequency source, with one cavity directly coupled to the source and the other cavity coupled through a delay line of special construction. A phase detector provides a bipolar d-c output signal proportional to the difference in phase between the voltage in the two cavities. This d-c signal controls a bias supply which provides a d-c output for varying the capacitnce of voltage sensitive capacitors in the delay line. The over-all operation of the circuit is completely electronic, overcoming the time response limitations of the electromechanical control systems, and the relative phase relationship of the radio frequency voltages in the two caviiies is continuously controlled to effect particle acceleration.

  11. ELECTRON IRRADIATION OF SOLIDS

    DOE Patents [OSTI]

    Damask, A.C.

    1959-11-01

    A method is presented for altering physical properties of certain solids, such as enhancing the usefulness of solids, in which atomic interchange occurs through a vacancy mechanism, electron irradiation, and temperature control. In a centain class of metals, alloys, and semiconductors, diffusion or displacement of atoms occurs through a vacancy mechanism, i.e., an atom can only move when there exists a vacant atomic or lattice site in an adjacent position. In the process of the invention highenergy electron irradiation produces additional vacancies in a solid over those normally occurring at a given temperature and allows diffusion of the component atoms of the solid to proceed at temperatures at which it would not occur under thermal means alone in any reasonable length of time. The invention offers a precise way to increase the number of vacancies and thereby, to a controlled degree, change the physical properties of some materials, such as resistivity or hardness.

  12. Power Electronics and Controls

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electronics and Controls - Sandia Energy Energy Search Icon Sandia Home Locations Contact Us Employee Locator Energy & Climate Secure & Sustainable Energy Future Stationary Power Energy Conversion Efficiency Solar Energy Wind Energy Water Power Supercritical CO2 Geothermal Natural Gas Safety, Security & Resilience of the Energy Infrastructure Energy Storage Nuclear Power & Engineering Grid Modernization Battery Testing Nuclear Energy Defense Waste Management Programs Advanced

  13. Computational Electronics and Electromagnetics

    SciTech Connect (OSTI)

    DeFord, J.F.

    1993-03-01

    The Computational Electronics and Electromagnetics thrust area is a focal point for computer modeling activities in electronics and electromagnetics in the Electronics Engineering Department of Lawrence Livermore National Laboratory (LLNL). Traditionally, they have focused their efforts in technical areas of importance to existing and developing LLNL programs, and this continues to form the basis for much of their research. A relatively new and increasingly important emphasis for the thrust area is the formation of partnerships with industry and the application of their simulation technology and expertise to the solution of problems faced by industry. The activities of the thrust area fall into three broad categories: (1) the development of theoretical and computational models of electronic and electromagnetic phenomena, (2) the development of useful and robust software tools based on these models, and (3) the application of these tools to programmatic and industrial problems. In FY-92, they worked on projects in all of the areas outlined above. The object of their work on numerical electromagnetic algorithms continues to be the improvement of time-domain algorithms for electromagnetic simulation on unstructured conforming grids. The thrust area is also investigating various technologies for conforming-grid mesh generation to simplify the application of their advanced field solvers to design problems involving complicated geometries. They are developing a major code suite based on the three-dimensional (3-D), conforming-grid, time-domain code DSI3D. They continue to maintain and distribute the 3-D, finite-difference time-domain (FDTD) code TSAR, which is installed at several dozen university, government, and industry sites.

  14. Xyce parallel electronic simulator.

    SciTech Connect (OSTI)

    Keiter, Eric Richard; Mei, Ting; Russo, Thomas V.; Rankin, Eric Lamont; Schiek, Richard Louis; Thornquist, Heidi K.; Fixel, Deborah A.; Coffey, Todd Stirling; Pawlowski, Roger Patrick; Santarelli, Keith R.

    2010-05-01

    This document is a reference guide to the Xyce Parallel Electronic Simulator, and is a companion document to the Xyce Users' Guide. The focus of this document is (to the extent possible) exhaustively list device parameters, solver options, parser options, and other usage details of Xyce. This document is not intended to be a tutorial. Users who are new to circuit simulation are better served by the Xyce Users' Guide.

  15. Determination of pigments in colour layers on walls of some selected historical buildings using optical and scanning electron microscopy

    SciTech Connect (OSTI)

    Skapin, A. Sever Ropret, P. Bukovec, P.

    2007-11-15

    For successful restoration of painted walls and painted coloured finishing coats it is necessary to determine the composition of the original colour layers. Identification of the pigments used in The Cistercian Abbey of Sticna and The Manor of Novo Celje was carried out using optical and scanning electron microscopy. Selected samples of wall paintings were inspected by the combined application of an optical microscope and a low-vacuum Scanning Electron Microscope to determine their colour and structural features and to identify the position of individual pigment grains. Energy dispersive spectroscopy was used to determine the elemental distribution on selected surfaces and elemental composition of individual pigments. It was found that the most abundantly used pigments were iron oxide red, cinnabar, green earth, umber, calcium carbonate white, ultramarine, yellow ochre and carbon black. These identifications have allowed us to compare the use of various pigments in buildings from different historical periods.

  16. Towards demonstration of electron cooling with bunched electron beam

    SciTech Connect (OSTI)

    Fedotov, A.

    2012-01-11

    All electron cooling systems which were in operation so far employed electron beam generated with an electrostatic electron gun in DC operating mode, immersed in a longitudinal magnetic field. At low energies magnetic field is also being used to transport electron beam through the cooling section from the gun to the collector. At higher energies (few MeV), it was shown that one can have simpler electron beam transport without continuous magnetic field. Because of a rather weak magnetic field on the cathode and in the cooling section the latter approach was referred to as 'non-magnetized cooling', since there was no suppression of the transverse angular spread of the electron beam with the magnetic field in the cooling section. Such a cooler successfully operated at FNAL (2005-11) at electron beam energy of 4.3 MeV. Providing cooling at even higher energies would be easier with RF acceleration of electron beam, and thus using bunched electron beam for cooling. Significant efforts were devoted to explore various aspects of such bunched electron beam cooling as part of R and D of high-energy electron cooling for RHIC. However, experimental studies of such cooling are still lacking. Establishing this technique experimentally would be extremely useful for future high-energy applications. Presently there is an ongoing effort to build Proof-of-Principle (PoP) experiment of Coherent Electron Cooling (CEC) at RHIC, which promises to be superior to conventional electron cooling for high energies. Since the CEC experiment is based on bunched electron beam and it has sections where electron beam co-propagates with the ion beam at the same velocity, it also provides a unique opportunity to explore experimentally conventional electron cooling but for the first time with a bunched electron beam. As a result, it allows us to explore techniques needed for the high-energy electron cooling such as 'painting' with a short electron beam and control of ion beam distribution under

  17. Determination of the displacement energy of O, Si and Zr under electron beam irradiation

    SciTech Connect (OSTI)

    Edmondson, Philip D; Weber, William J; Namavar, Fereydoon; Zhang, Yanwen

    2012-01-01

    The response of nanocrystalline, stabilizer-free cubic zirconia thin films on a Si substrate to electron beam irradiation with energies of 4, 110 and 200 keV and fluences up to {approx}1.5 x 10{sup 22} e m{sup -2} has been studied to determine the displacement energies. The 110 and 200 keV irradiations were performed in situ using a transmission electron microscope; the 4 keV irradiations were performed ex situ using an electron gun. In all three irradiations, no structural modification of the zirconia was observed, despite the high fluxes and fluences. However the Si substrate on which the zirconia film was deposited was amorphized under the 200 keV electron irradiation. Examination of the electron-solid interactions reveals that the kinetic energy transfer from the 200 keV electrons to the silicon lattice is sufficient to cause atomic displacements, resulting in amorphization. The kinetic energy transfer from the 200 keV electrons to the oxygen sub-lattice of the zirconia may be sufficient to induce defect production, however, no evidence of defect production was observed. The displacement cross-section value of Zr was found to be {approx}400 times greater than that of O indicating that the O atoms are effectively screened from the electrons by the Zr atoms, and, therefore, the displacement of O is inefficient.

  18. Determination of the Displacement Energies of O, Si and Zr Under Electron Beam Irradiation

    SciTech Connect (OSTI)

    Edmondson, P. D.; Weber, William J.; Namavar, Fereydoon; Zhang, Yanwen

    2012-03-01

    The response of nanocrystalline, stabilizer-free cubic zirconia thin films on a Si substrate to electron beam irradiation with energies of 4, 110 and 200 keV and fluences up to ~1.5 x 10e m has been studied to determine the displacement energies. The 110 and 200 keV irradiations were performed in situ using a transmission electron microscope; the 4 keV irradiations were performed ex situ using an electron gun. In all three irradiations, no structural modification of the zirconia was observed, despite the high fluxes and fluences. However the Si substrate on which the zirconia film was deposited was amorphized under the 200 keV electron irradiation. Examination of the electronsolid interactions reveals that the kinetic energy transfer from the 200 keV electrons to the silicon lattice is sufficient to cause atomic displacements, resulting in amorphization. The kinetic energy transfer from the 200 keV electrons to the oxygen sub-lattice of the zirconia may be sufficient to induce defect production, however, no evidence of defect production was observed. The displacement cross-section value of Zr was found to be ~400 times greater than that of O indicating that the O atoms are effectively screened from the electrons by the Zr atoms, and, therefore, the displacement of O is inefficient.

  19. Electron Cooling Study for MEIC

    SciTech Connect (OSTI)

    He, Zhang; Douglas, David R.; Derbenev, Yaroslav S.; Zhang, Yuhong

    2015-09-01

    Electron cooling of the ion beams is one critical R&D to achieve high luminosities in JLab's MEIC proposal. In the present MEIC design, a multi-staged cooling scheme is adapted, which includes DC electron cooling in the booster ring and bunched beam electron cooling in the collider ring at both the injection energy and the collision energy. We explored the feasibility of using both magnetized and non-magnetized electron beam for cooling, and concluded that a magnetized electron beam is necessary. Electron cooling simulation results for the newly updated MEIC design is also presented.

  20. Compact electron beam focusing column

    SciTech Connect (OSTI)

    Persaud, Arun; Leung, Ka-Ngo; Reijonen, Jani

    2001-07-13

    A novel design for an electron beam focusing column has been developed at LBNL. The design is based on a low-energy spread multicusp plasma source which is used as a cathode for electron beam production. The focusing column is 10 mm in length. The electron beam is focused by means of electrostatic fields. The column is designed for a maximum voltage of 50 kV. Simulations of the electron trajectories have been performed by using the 2-D simulation code IGUN and EGUN. The electron temperature has also been incorporated into the simulations. The electron beam simulations, column design and fabrication will be discussed in this presentation.

  1. Single electron beam rf feedback free electron laser

    DOE Patents [OSTI]

    Brau, C.A.; Stein, W.E.; Rockwood, S.D.

    1981-02-11

    A free electron laser system and electron beam system for a free electron laser which uses rf feedback to enhance efficiency are described. Rf energy is extracted from a single electron beam by decelerating cavities and energy is returned to accelerating cavities using rf returns, such as rf waveguides, rf feedthroughs, resonant feedthroughs, etc. This rf energy is added to rf klystron energy to reduce the required input energy and thereby enhance energy efficiency of the system.

  2. Ultrafast Time-Resolved Electron Diffraction with Megavolt Electron Beams

    SciTech Connect (OSTI)

    Hastings, J.B.; Rudakov, F.M.; Dowell, D.H.; Schmerge, J.F.; Cardoza, J.D.; Castro, J.M.; Gierman, S.M.; Loos, H.; Weber, P.M.; /Brown U.

    2006-10-24

    An rf photocathode electron gun is used as an electron source for ultrafast time-resolved pump-probe electron diffraction. We observed single-shot diffraction patterns from a 160 nm Al foil using the 5.4 MeV electron beam from the Gun Test Facility at the Stanford Linear Accelerator. Excellent agreement with simulations suggests that single-shot diffraction experiments with a time resolution approaching 100 fs are possible.

  3. Energy Storage & Power Electronics 2008 Peer Review - Power Electronics

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    (PE) Systems Presentations | Department of Energy Power Electronics (PE) Systems Presentations Energy Storage & Power Electronics 2008 Peer Review - Power Electronics (PE) Systems Presentations The 2008 Peer Review Meeting for the DOE Energy Storage and Power Electronics Program (ESPE) was held in Washington DC on Sept. 29-30, 2008. Current and completed program projects were presented and reviewed by a group of industry professionals. The 2008 agenda was composed of 28 projects that

  4. Increased bismuth concentration in MBE GaAs{sub 1−x}Bi{sub x} films by oscillating III/V flux ratio during growth

    SciTech Connect (OSTI)

    Wood, Adam W. Babcock, Susan E.; Li, Jincheng; Brown, April S.

    2015-05-15

    The authors have examined bismuth concentration profiles in GaAs{sub 1−x}Bi{sub x} films grown by molecular beam epitaxy using high angle annular dark field imaging (Z-contrast imaging) in an aberration-corrected scanning transmission electron microscope in conjunction with x-ray diffraction. Samples were grown with a gradient in each of the component fluxes, and therefore, the III/V ratio across the substrate. Rotating the sample during growth exposed the growth surface to an oscillating III/V flux ratio. Sinusoidal [Bi] profiles resulted in the growth direction, the wavelength and number of which were consistent with the growth rate and the rate of substrate rotation. However, the magnitude of [Bi] in the observed fluctuations was greater than the maximum [Bi] achieved using the same Bi flux and Ga/As flux ratios in steady-state conditions on a stationary substrate, suggesting that varying the III/V flux ratio during growth promotes the incorporation of Bi in GaAs{sub 1−x}Bi{sub x} films. A proposed qualitative model for how this enhancement might occur hypothesizes a critical role for alternating growth and shrinkage of Ga-Bi predroplet clusters on the surface as the growing material is rotated through Ga-rich and As-rich flux compositions.

  5. Quantifying stoichiometry-induced variations in structure and energy of a SrTiO3 symmetric ?13 {510}/<100?>?grain boundary

    SciTech Connect (OSTI)

    Yang, Hao; Lee, H. S.; Sarahan, M. C.; Sato, Yoichi; Chi, Miaofang; Moeck, Peter; Ikuhara, Yuichi; Browning, Nigel D.

    2013-04-01

    shown to readily accommodate nonstoichiometry changing the electrostatic potential at the boundary plane and effectively controlling material properties such as capacitance, magnetoresistance and superconductivity. Understanding and quantifying exactly how variations in atomic scale nonstoichiometry at the boundary plane extend to the practical mesoscale operating length of the system is therefore critical for improving the overall properties. Bicrystals of SrTiO3 were fabricated to provide the model GB model structures that are analysed in this paper. We show that statistical analysis of aberration-corrected scanning transmission electron microscope images acquired from a large area of GB is an effective routine to understanding the variation in boundary structure that occurs to accommodate nonstoichiometry. In the case of the SrTiO3 22.6 ?13 (510)/[100] GB analysed here, the symmetric atomic structures observed from a micron-long GB can be categorized as two different competing structural arrangements, with and without a rigid-body translation along the boundary plane. How this quantified experimental approach can provide direct insights into the GB energetics is further confirmed from the first principles density functional theory, and the effect of nonstoichiometry in determining the GB energies is quantified.

  6. Atomic-Resolution Visualization of Distinctive Chemical Mixing Behavior of Ni, Co and Mn with Li in Layered Lithium Transition-Metal Oxide Cathode Materials

    SciTech Connect (OSTI)

    Yan, Pengfei; Zheng, Jianming; Lv, Dongping; Wei, Yi; Zheng, Jiaxin; Wang, Zhiguo; Kuppan, Saravanan; Yu, Jianguo; Luo, Langli; Edwards, Danny J.; Olszta, Matthew J.; Amine, Khalil; Liu, Jun; Xiao, Jie; Pan, Feng; Chen, Guoying; Zhang, Jiguang; Wang, Chong M.

    2015-07-06

    Capacity and voltage fading of layer structured cathode based on lithium transition metal oxide is closely related to the lattice position and migration behavior of the transition metal ions. However, it is scarcely clear about the behavior of each of these transition metal ions. We report direct atomic resolution visualization of interatomic layer mixing of transition metal (Ni, Co, Mn) and lithium ions in layer structured oxide cathodes for lithium ion batteries. Using chemical imaging with aberration corrected scanning transmission electron microscope (STEM) and DFT calculations, we discovered that in the layered cathodes, Mn and Co tend to reside almost exclusively at the lattice site of transition metal (TM) layer in the structure or little interlayer mixing with Li. In contrast, Ni shows high degree of interlayer mixing with Li. The fraction of Ni ions reside in the Li layer followed a near linear dependence on total Ni concentration before reaching saturation. The observed distinctively different behavior of Ni with respect to Co and Mn provides new insights on both capacity and voltage fade in this class of cathode materials based on lithium and TM oxides, therefore providing scientific basis for selective tailoring of oxide cathode materials for enhanced performance.

  7. Nanoscale origins of the damage tolerance of the high-entropy alloy CrMnFeCoNi

    SciTech Connect (OSTI)

    Zhang, ZiJiao; Mao, M. M.; Wang, Jiangwei; Gludovatz, Bernd; Zhang, Ze; Mao, Scott X.; George, Easo P.; Yu, Qian; Ritchie, Robert O.

    2015-12-09

    Damage tolerance can be an elusive characteristic of structural materials requiring both high strength and ductility, properties that are often mutually exclusive. High-entropy alloys are of interest in this regard. Specifically, the single-phase CrMnFeCoNi alloy displays tensile strength levels of ~1 GPa, excellent ductility (~60–70%) and exceptional fracture toughness (KJIc>200M Pa√m). Here through the use of in situ straining in an aberration-corrected transmission electron microscope, we report on the salient atomistic to micro-scale mechanisms underlying the origin of these properties. We identify a synergy of multiple deformation mechanisms, rarely achieved in metallic alloys, which generates high strength, work hardening and ductility, including the easy motion of Shockley partials, their interactions to form stacking-fault parallelepipeds, and arrest at planar slip bands of undissociated dislocations. In conclusion, we further show that crack propagation is impeded by twinned, nanoscale bridges that form between the near-tip crack faces and delay fracture by shielding the crack tip.

  8. Nanoscale origins of the damage tolerance of the high-entropy alloy CrMnFeCoNi

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Zhang, ZiJiao; Mao, M. M.; Wang, Jiangwei; Gludovatz, Bernd; Zhang, Ze; Mao, Scott X.; George, Easo P.; Yu, Qian; Ritchie, Robert O.

    2015-12-09

    Damage tolerance can be an elusive characteristic of structural materials requiring both high strength and ductility, properties that are often mutually exclusive. High-entropy alloys are of interest in this regard. Specifically, the single-phase CrMnFeCoNi alloy displays tensile strength levels of ~1 GPa, excellent ductility (~60–70%) and exceptional fracture toughness (KJIc>200M Pa√m). Here through the use of in situ straining in an aberration-corrected transmission electron microscope, we report on the salient atomistic to micro-scale mechanisms underlying the origin of these properties. We identify a synergy of multiple deformation mechanisms, rarely achieved in metallic alloys, which generates high strength, work hardening andmore » ductility, including the easy motion of Shockley partials, their interactions to form stacking-fault parallelepipeds, and arrest at planar slip bands of undissociated dislocations. In conclusion, we further show that crack propagation is impeded by twinned, nanoscale bridges that form between the near-tip crack faces and delay fracture by shielding the crack tip.« less

  9. Response of nanostructured ferritic alloys to high-dose heavy ion irradiation

    SciTech Connect (OSTI)

    Parish, Chad M.; White, Ryan M.; LeBeau, James M.; Miller, Michael K.

    2014-02-01

    A latest-generation aberration-corrected scanning/transmission electron microscope (STEM) is used to study heavy-ion-irradiated nanostructured ferritic alloys (NFAs). Results are presented for STEM X-ray mapping of NFA 14YWT irradiated with 10 MeV Pt to 16 or 160 dpa at -100°C and 750°C, as well as pre-irradiation reference material. Irradiation at -100°C results in ballistic destruction of the beneficial microstructural features present in the pre-irradiated reference material, such as Ti-Y-O nanoclusters (NCs) and grain boundary (GB) segregation. Irradiation at 750°C retains these beneficial features, but indicates some coarsening of the NCs, diffusion of Al to the NCs, and a reduction of the Cr-W GB segregation (or solute excess) content. Ion irradiation combined with the latest-generation STEM hardware allows for rapid screening of fusion candidate materials and improved understanding of irradiation-induced microstructural changes in NFAs.

  10. High-stability cryogenic scanning tunneling microscope based on a closed-cycle cryostat

    SciTech Connect (OSTI)

    Hackley, Jason D.; Kislitsyn, Dmitry A.; Beaman, Daniel K.; Nazin, George V.; Ulrich, Stefan

    2014-10-15

    We report on the design and operation of a cryogenic ultra-high vacuum (UHV) scanning tunneling microscope (STM) coupled to a closed-cycle cryostat (CCC). The STM is thermally linked to the CCC through helium exchange gas confined inside a volume enclosed by highly flexible rubber bellows. The STM is thus mechanically decoupled from the CCC, which results in a significant reduction of the mechanical noise transferred from the CCC to the STM. Noise analysis of the tunneling current shows current fluctuations up to 4% of the total current, which translates into tip-sample distance variations of up to 1.5 picometers. This noise level is sufficiently low for atomic-resolution imaging of a wide variety of surfaces. To demonstrate this, atomic-resolution images of Au(111) and NaCl(100)/Au(111) surfaces, as well as of carbon nanotubes deposited on Au(111), were obtained. Thermal drift analysis showed that under optimized conditions, the lateral stability of the STM scanner can be as low as 0.18 /h. Scanning Tunneling Spectroscopy measurements based on the lock-in technique were also carried out, and showed no detectable presence of noise from the closed-cycle cryostat. Using this cooling approach, temperatures as low as 16 K at the STM scanner have been achieved, with the complete cool-down of the system typically taking up to 12 h. These results demonstrate that the constructed CCC-coupled STM is a highly stable instrument capable of highly detailed spectroscopic investigations of materials and surfaces at the atomic scale.

  11. Microscopic conductivity of lattice fermions at equilibrium. I. Non-interacting particles

    SciTech Connect (OSTI)

    Bru, J.-B.; Siqueira Pedra, W. de; Hertling, C.

    2015-05-15

    We consider free lattice fermions subjected to a static bounded potential and a time- and space-dependent electric field. For any bounded convex region ℛ ⊂ ℝ{sup d} (d ≥ 1) of space, electric fields E within R drive currents. At leading order, uniformly with respect to the volume |R| of R and the particular choice of the static potential, the dependency on E of the current is linear and described by a conductivity (tempered, operator-valued) distribution. Because of the positivity of the heat production, the real part of its Fourier transform is a positive measure, named here (microscopic) conductivity measure of R, in accordance with Ohm’s law in Fourier space. This finite measure is the Fourier transform of a time-correlation function of current fluctuations, i.e., the conductivity distribution satisfies Green–Kubo relations. We additionally show that this measure can also be seen as the boundary value of the Laplace–Fourier transform of a so-called quantum current viscosity. The real and imaginary parts of conductivity distributions are related to each other via the Hilbert transform, i.e., they satisfy Kramers–Kronig relations. At leading order, uniformly with respect to parameters, the heat production is the classical work performed by electric fields on the system in presence of currents. The conductivity measure is uniformly bounded with respect to parameters of the system and it is never the trivial measure 0 dν. Therefore, electric fields generally produce heat in such systems. In fact, the conductivity measure defines a quadratic form in the space of Schwartz functions, the Legendre–Fenchel transform of which describes the resistivity of the system. This leads to Joule’s law, i.e., the heat produced by currents is proportional to the resistivity and the square of currents.

  12. Physically motivated global alignment method for electron tomography

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Sanders, Toby; Prange, Micah; Akatay, Cem; Binev, Peter

    2015-04-08

    Electron tomography is widely used for nanoscale determination of 3-D structures in many areas of science. Determining the 3-D structure of a sample from electron tomography involves three major steps: acquisition of sequence of 2-D projection images of the sample with the electron microscope, alignment of the images to a common coordinate system, and 3-D reconstruction and segmentation of the sample from the aligned image data. The resolution of the 3-D reconstruction is directly influenced by the accuracy of the alignment, and therefore, it is crucial to have a robust and dependable alignment method. In this paper, we develop amore » new alignment method which avoids the use of markers and instead traces the computed paths of many identifiable ‘local’ center-of-mass points as the sample is rotated. Compared with traditional correlation schemes, the alignment method presented here is resistant to cumulative error observed from correlation techniques, has very rigorous mathematical justification, and is very robust since many points and paths are used, all of which inevitably improves the quality of the reconstruction and confidence in the scientific results.« less

  13. Physically motivated global alignment method for electron tomography

    SciTech Connect (OSTI)

    Sanders, Toby; Prange, Micah; Akatay, Cem; Binev, Peter

    2015-04-08

    Electron tomography is widely used for nanoscale determination of 3-D structures in many areas of science. Determining the 3-D structure of a sample from electron tomography involves three major steps: acquisition of sequence of 2-D projection images of the sample with the electron microscope, alignment of the images to a common coordinate system, and 3-D reconstruction and segmentation of the sample from the aligned image data. The resolution of the 3-D reconstruction is directly influenced by the accuracy of the alignment, and therefore, it is crucial to have a robust and dependable alignment method. In this paper, we develop a new alignment method which avoids the use of markers and instead traces the computed paths of many identifiable ‘local’ center-of-mass points as the sample is rotated. Compared with traditional correlation schemes, the alignment method presented here is resistant to cumulative error observed from correlation techniques, has very rigorous mathematical justification, and is very robust since many points and paths are used, all of which inevitably improves the quality of the reconstruction and confidence in the scientific results.

  14. Few Electron Quantum Dot coupling ...

    Office of Scientific and Technical Information (OSTI)

    Electron Quantum Dot coupling to Donor Implanted Electron Spins Martin Rudolph1. P. Harvey-Collard12, E. Nielson1, J.K. Gamble1, R. Muller1, T. Jacobson1, G. Ten-Eyck1, J. ...

  15. Visualization of electronic density

    DOE Public Access Gateway for Energy & Science Beta (PAGES Beta)

    Grosso, Bastien; Cooper, Valentino R.; Pine, Polina; Hashibon, Adham; Yaish, Yuval; Adler, Joan

    2015-04-22

    An atom’s volume depends on its electronic density. Although this density can only be evaluated exactly for hydrogen-like atoms, there are many excellent numerical algorithms and packages to calculate it for other materials. 3D visualization of charge density is challenging, especially when several molecular/atomic levels are intertwined in space. We explore several approaches to 3D charge density visualization, including the extension of an anaglyphic stereo visualization application based on the AViz package to larger structures such as nanotubes. We will describe motivations and potential applications of these tools for answering interesting questions about nanotube properties.

  16. Business Electronic Reading Room

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electronic Reading Room SOLICITATION UPDATES: Reference No. DE-SOL-0007251: Contract DE-FE0026066 has been awarded to SSC-Deltha, LLC., in response to the Site Administrative Support (SAS) services solicitation (DE-SOL-0007251). Reference No. DE-SOL-0006851: Contract DE -FE0024337 has been awarded to DFW Security Protective Force, Inc., in response to the Site Security Services solicitation (DE-SOL-0006851) Reference No. DE-SOL-0005388: Contract DE-FE0025912 has been awarded to KeyLogic Systems,

  17. VIA ELECTRONIC SUBMISSION

    Office of Energy Efficiency and Renewable Energy (EERE) Indexed Site

    39 MacDougal Street, Third Floor * New York, New York 10012 * (212) 992-8932 * www.policyintegrity.org March 21, 2011 VIA ELECTRONIC SUBMISSION Office of the General Counsel US Department of Energy Washington, DC Attention: Regulatory Burden RFI - Docket No. DOE-HQ-2011-0014-0001 Subject: Response to Request for Information on "Reducing Regulatory Burden," 76 Fed. Reg. 6123 (Feb. 3, 2011) The Institute for Policy Integrity at New York University School of Law submits the following

  18. Calculation of Electron Trajectories

    Energy Science and Technology Software Center (OSTI)

    1982-06-01

    EGUN, the SLAC Electron Trajectory Program, computes trajectories of charged particles in electrostatic and magnetostatic focusing systems including the effects of space charge and self-magnetic fields. Starting options include Child''s Law conditions on cathodes of various shapes, user-specified initial conditions for each ray, and a combination of Child''s Law conditions and user specifications. Either rectangular or cylindrically symmetric geometry may be used. Magnetic fields may be specified using arbitrary configuration of coils, or the outputmore » of a magnet program, such as Poisson, or by an externally calculated array of the axial fields.« less

  19. High Availability Electronics Standards

    SciTech Connect (OSTI)

    Larsen, R.S.; /SLAC

    2006-12-13

    Availability modeling of the proposed International Linear Collider (ILC) predicts unacceptably low uptime with current electronics systems designs. High Availability (HA) analysis is being used as a guideline for all major machine systems including sources, utilities, cryogenics, magnets, power supplies, instrumentation and controls. R&D teams are seeking to achieve total machine high availability with nominal impact on system cost. The focus of this paper is the investigation of commercial standard HA architectures and packaging for Accelerator Controls and Instrumentation. Application of HA design principles to power systems and detector instrumentation are also discussed.

  20. Visualization of electronic density

    SciTech Connect (OSTI)

    Grosso, Bastien; Cooper, Valentino R.; Pine, Polina; Hashibon, Adham; Yaish, Yuval; Adler, Joan

    2015-04-22

    An atoms volume depends on its electronic density. Although this density can only be evaluated exactly for hydrogen-like atoms, there are many excellent numerical algorithms and packages to calculate it for other materials. 3D visualization of charge density is challenging, especially when several molecular/atomic levels are intertwined in space. We explore several approaches to 3D charge density visualization, including the extension of an anaglyphic stereo visualization application based on the AViz package to larger structures such as nanotubes. We will describe motivations and potential applications of these tools for answering interesting questions about nanotube properties.

  1. Electron Bubbles in Liquid Helium

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Bubbles in Liquid Helium and Quantum Mechanics Humphrey J. Maris Brown University September 16, 2015 4:00 p.m. An electron entering liquid helium forces open a cavity referred to as an electron bubble. These objects have been studied in many past experiments and appear to be well understood. However, experiments have revealed that in addition to these normal electron bubbles there are other negatively charged objects in liquid helium. Despite much effort the structure of these so-called

  2. Forward Electronics | Open Energy Information

    Open Energy Info (EERE)

    focussed on optoelectronics, information appliances, consumer electronics and communication. Coordinates: 25.080441, 121.564194 Show Map Loading map......

  3. Rf Feedback free electron laser

    DOE Patents [OSTI]

    Brau, Charles A.; Swenson, Donald A.; Boyd, Jr., Thomas J.

    1981-01-01

    A free electron laser system and electron beam system for a free electron laser which use rf feedback to enhance efficiency. Rf energy is extracted from an electron beam by decelerating cavities and returned to accelerating cavities using rf returns such as rf waveguides, rf feedthroughs, etc. This rf energy is added to rf klystron energy to lower the required input energy and thereby enhance energy efficiency of the system.

  4. Rf feedback free electron laser

    DOE Patents [OSTI]

    Brau, C.A.; Swenson, D.A.; Boyd, T.J. Jr.

    1979-11-02

    A free electron laser system and electron beam system for a free electron laser are provided which use rf feedback to enhance efficiency. Rf energy is extracted from an electron beam by decelerating cavities and returned to accelerating cavities using rf returns such as rf waveguides, rf feedthroughs, etc. This rf energy is added to rf klystron energy to lower the required input energy and thereby enhance energy efficiency of the system.

  5. Unbalanced field RF electron gun

    DOE Patents [OSTI]

    Hofler, Alicia

    2013-11-12

    A design for an RF electron gun having a gun cavity utilizing an unbalanced electric field arrangement. Essentially, the electric field in the first (partial) cell has higher field strength than the electric field in the second (full) cell of the electron gun. The accompanying method discloses the use of the unbalanced field arrangement in the operation of an RF electron gun in order to accelerate an electron beam.

  6. Electronic security device

    DOE Patents [OSTI]

    Eschbach, Eugene A.; LeBlanc, Edward J.; Griffin, Jeffrey W.

    1992-01-01

    The present invention relates to a security device having a control box (12) containing an electronic system (50) and a communications loop (14) over which the system transmits a signal. The device is constructed so that the communications loop can extend from the control box across the boundary of a portal such as a door into a sealed enclosure into which access is restricted whereby the loop must be damaged or moved in order for an entry to be made into the enclosure. The device is adapted for detecting unauthorized entries into such enclosures such as rooms or containers and for recording the time at which such entries occur for later reference. Additionally, the device detects attempts to tamper or interfere with the operation of the device itself and records the time at which such events take place. In the preferred embodiment, the security device includes a microprocessor-based electronic system (50) and a detection module (72) capable of registering changes in the voltage and phase of the signal transmitted over the loop.

  7. Electronic security device

    DOE Patents [OSTI]

    Eschbach, E.A.; LeBlanc, E.J.; Griffin, J.W.

    1992-03-17

    The present invention relates to a security device having a control box containing an electronic system and a communications loop over which the system transmits a signal. The device is constructed so that the communications loop can extend from the control box across the boundary of a portal such as a door into a sealed enclosure into which access is restricted whereby the loop must be damaged or moved in order for an entry to be made into the enclosure. The device is adapted for detecting unauthorized entries into such enclosures such as rooms or containers and for recording the time at which such entries occur for later reference. Additionally, the device detects attempts to tamper or interfere with the operation of the device itself and records the time at which such events take place. In the preferred embodiment, the security device includes a microprocessor-based electronic system and a detection module capable of registering changes in the voltage and phase of the signal transmitted over the loop. 11 figs.

  8. Disparity of secondary electron emission in ferroelectric domains of YMnO{sub 3}

    SciTech Connect (OSTI)

    Cheng, Shaobo; Deng, S. Q.; Yuan, Wenjuan; Yan, Yunjie; Zhu, Jing; Li, J.; Li, J. Q.

    2015-07-20

    The applications of multiferroic materials require our understanding about the behaviors of domains with different polarization directions. Taking advantage of the scanning electron microscope, we investigate the polar surface of single crystal YMnO{sub 3} sample in secondary electron (SE) mode. By slowing down the scanning speed of electron beam, the negative surface potential of YMnO{sub 3} can be realized, and the domain contrast can be correspondingly changed. Under this experimental condition, with the help of a homemade Faraday cup, the difference of intrinsic SE emission coefficients of antiparallel domains is measured to be 0.12 and the downward polarization domains show a larger SE emission ability. Our results indicate that the total SE emission of this material can be altered by changing the ratio of the antiparallel domains, which provide an avenue for device design with this kind of materials.

  9. Fluctuation characteristics and transport properties of collisionless trapped electron mode turbulence

    SciTech Connect (OSTI)

    Xiao Yong; Holod, Ihor; Zhang Wenlu; Lin Zhihong [Department of Physics and Astronomy, University of California, Irvine, California 92697 (United States); Klasky, Scott [Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

    2010-02-15

    The collisionless trapped electron mode turbulence is investigated by global gyrokinetic particle simulation. The zonal flow dominated by low frequency and short wavelength acts as a very important saturation mechanism. The turbulent eddies are mostly microscopic, but with a significant portion in the mesoscale. The ion heat transport is found to be diffusive and follows the local radial profile of the turbulence intensity. However, the electron heat transport demonstrates some nondiffusive features and only follows the global profile of the turbulence intensity. The nondiffusive features of the electron heat transport is further confirmed by nonlognormal statistics of the flux-surface-averaged electron heat flux. The radial and time correlation functions are calculated to obtain the radial correlation length and autocorrelation time. Characteristic time scale analysis shows that the zonal flow shearing time and eddy turnover time are very close to the effective decorrelation time, which suggests that the trapped electrons move with the fluid eddies. The fluidlike behaviors of the trapped electrons and the persistence of the mesoscale eddies contribute to the transition of the electron turbulent transport from gyro-Bohm scaling to Bohm scaling when the device size decreases.

  10. ELECTRONIC PULSE SCALING CIRCUITS

    DOE Patents [OSTI]

    Cooke-Yarborough, E.H.

    1958-11-18

    Electronic pulse scaling circults of the klnd comprlsing a serles of bi- stable elements connected ln sequence, usually in the form of a rlng so as to be cycllcally repetitive at the highest scallng factor, are described. The scaling circuit comprises a ring system of bi-stable elements each arranged on turn-off to cause, a succeeding element of the ring to be turned-on, and one being arranged on turn-off to cause a further element of the ring to be turned-on. In addition, separate means are provided for applying a turn-off pulse to all the elements simultaneously, and for resetting the elements to a starting condition at the end of each cycle.

  11. Personnel electronic neutron dosimeter

    DOE Patents [OSTI]

    Falk, Roger B.; Tyree, William H.

    1984-12-18

    A personnel electronic dosimeter includes a neutron-proton and neutron-alpha converter for providing an electrical signal having a magnitude proportional to the energy of a detected proton or alpha particle produced from the converter, a pulse generator circuit for generating a pulse having a duration controlled by the weighed effect of the amplitude of the electrical signal, an oscillator enabled by the pulse for generating a train of clock pulses for a time dependent upon the pulse length, a counter for counting the clock pulses, and an indicator for providing a direct reading and aural alarm when the count indicates that the wearer has been exposed to a selected level of neutron dose equivalent.

  12. Personnel electronic neutron dosimeter

    DOE Patents [OSTI]

    Falk, R.B.; Tyree, W.H.

    1982-03-03

    A personnel electronic dosimeter includes a neutron-proton and neutron-alpha converter for providing an electrical signal having a magnitude proportional to the energy of a detected proton or alpha particle produced from the converter, a pulse generator circuit for generating a pulse having a duration controlled by the weighed effect of the amplitude of the electrical signal, an oscillator enabled by the pulse for generating a train of clock pulses for a time dependent upon the pulse length, a counter for counting the clock pulses, and an indicator for providing a direct reading and aural alarm when the count indicates that the wearer has been exposed to a selected level of neutron dose equivalent.

  13. Creep in electronic ceramics

    SciTech Connect (OSTI)

    Routbort, J. L.; Goretta, K. C.; Arellano-Lopez, A. R.

    2000-04-27

    High-temperature creep measurements combined with microstructural investigations can be used to elucidate deformation mechanisms that can be related to the diffusion kinetics and defect chemistry of the minority species. This paper will review the theoretical basis for this correlation and illustrate it with examples from some important electronic ceramics having a perovskite structure. Recent results on BaTiO{sub 3}, (La{sub 1{minus}x}Sr){sub 1{minus}y}MnO{sub 3+{delta}}, YBa{sub 2}Cu{sub 3}O{sub x}, Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub x}, (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x} and Sr(Fe,Co){sub 1.5}O{sub x} will be presented.

  14. ELECTRONIC TRIGGER CIRCUIT

    DOE Patents [OSTI]

    Russell, J.A.G.

    1958-01-01

    An electronic trigger circuit is described of the type where an output pulse is obtained only after an input voltage has cqualed or exceeded a selected reference voltage. In general, the invention comprises a source of direct current reference voltage in series with an impedance and a diode rectifying element. An input pulse of preselected amplitude causes the diode to conduct and develop a signal across the impedance. The signal is delivered to an amplifier where an output pulse is produced and part of the output is fed back in a positive manner to the diode so that the amplifier produces a steep wave front trigger pulsc at the output. The trigger point of the described circuit is not subject to variation due to the aging, etc., of multi-electrode tabes, since the diode circuit essentially determines the trigger point.

  15. ELECTRONIC MULTIPLIER CIRCUIT

    DOE Patents [OSTI]

    Thomas, R.E.

    1959-08-25

    An electronic multiplier circuit is described in which an output voltage having an amplitude proportional to the product or quotient of the input signals is accomplished in a novel manner which facilitates simplicity of circuit construction and a high degree of accuracy in accomplishing the multiplying and dividing function. The circuit broadly comprises a multiplier tube in which the plate current is proportional to the voltage applied to a first control grid multiplied by the difference between voltage applied to a second control grid and the voltage applied to the first control grid. Means are provided to apply a first signal to be multiplied to the first control grid together with means for applying the sum of the first signal to be multiplied and a second signal to be multiplied to the second control grid whereby the plate current of the multiplier tube is proportional to the product of the first and second signals to be multiplied.

  16. ELECTRONIC INTEGRATING CIRCUIT

    DOE Patents [OSTI]

    Englemann, R.H.

    1963-08-20

    An electronic integrating circuit using a transistor with a capacitor connected between the emitter and collector through which the capacitor discharges at a rate proportional to the input current at the base is described. Means are provided for biasing the base with an operating bias and for applying a voltage pulse to the capacitor for charging to an initial voltage. A current dividing diode is connected between the base and emitter of the transistor, and signal input terminal means are coupled to the juncture of the capacitor and emitter and to the base of the transistor. At the end of the integration period, the residual voltage on said capacitor is less by an amount proportional to the integral of the input signal. Either continuous or intermittent periods of integration are provided. (AEC)

  17. Tokyo Electron PV | Open Energy Information

    Open Energy Info (EERE)

    PV Jump to: navigation, search Name: Tokyo Electron PV Place: Nirasaki City, Yamanashi, Japan Product: Japanese electronics giants Tokyo Electron and Sharp have announced their...

  18. Diamondoid Monolayers as Monochromatic Electron Source

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Scientific applications also stand to benefit greatly, such as electron-beam lithography, electron microscopy, and next-generation free-electron lasers. Diamondoids are molecular ...

  19. A compact electron gun for time-resolved electron diffraction

    SciTech Connect (OSTI)

    Robinson, Matthew S.; Lane, Paul D.; Wann, Derek A.

    2015-01-15

    A novel compact time-resolved electron diffractometer has been built with the primary goal of studying the ultrafast molecular dynamics of photoexcited gas-phase molecules. Here, we discuss the design of the electron gun, which is triggered by a Ti:Sapphire laser, before detailing a series of calibration experiments relating to the electron-beam properties. As a further test of the apparatus, initial diffraction patterns have been collected for thin, polycrystalline platinum samples, which have been shown to match theoretical patterns. The data collected demonstrate the focusing effects of the magnetic lens on the electron beam, and how this relates to the spatial resolution of the diffraction pattern.

  20. Untangling the contributions of image charge and laser profile for optimal photoemission of high-brightness electron beams

    SciTech Connect (OSTI)

    Portman, J.; Zhang, H.; Makino, K.; Ruan, C. Y.; Berz, M.; Duxbury, P. M.

    2014-11-07

    Using our model for the simulation of photoemission of high brightness electron beams, we investigate the virtual cathode physics and the limits to spatio-temporal and spectroscopic resolution originating from the image charge on the surface and from the profile of the exciting laser pulse. By contrasting the effect of varying surface properties (leading to expanding or pinned image charge), laser profiles (Gaussian, uniform, and elliptical), and aspect ratios (pancake- and cigar-like) under different extraction field strengths and numbers of generated electrons, we quantify the effect of these experimental parameters on macroscopic pulse properties such as emittance, brightness (4D and 6D), coherence length, and energy spread. Based on our results, we outline optimal conditions of pulse generation for ultrafast electron microscope systems that take into account constraints on the number of generated electrons and on the required time resolution.

  1. Electronic Registration Form - Hanford Site

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    About Us Hanford Site Wide Programs Health & Safety Exposition Electronic Registration Form About Us Hanford Cultural Resources Charging Your Time Committee Members Contact Us Electronic Registration Form Exhibitor and Vendor Information EXPO 2016 Sponsors EXPO Award Criteria How to Get to TRAC Special Events What is EXPO Why Should I Participate in EXPO Electronic Registration Form Email Email Page | Print Print Page | Text Increase Font Size Decrease Font Size * Fields marked with an

  2. Electronic structure of superconductivity refined

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electronic structure of superconductivity refined Electronic structure of superconductivity refined A team of physicists propose a new model that expands on a little understood aspect of the electronic structure in high-temperature superconductors. July 10, 2008 Los Alamos National Laboratory sits on top of a once-remote mesa in northern New Mexico with the Jemez mountains as a backdrop to research and innovation covering multi-disciplines from bioscience, sustainable energy sources, to plasma

  3. Wisconsin SRF Electron Gun Commissioning

    SciTech Connect (OSTI)

    Bisognano, Joseph J.; Bissen, M.; Bosch, R.; Efremov, M.; Eisert, D.; Fisher, M.; Green, M.; Jacobs, K.; Keil, R.; Kleman, K.; Rogers, G.; Severson, M.; Yavuz, D. D.; Legg, Robert A.; Bachimanchi, Ramakrishna; Hovater, J. Curtis; Plawski, Tomasz; Powers, Thomas J.

    2013-12-01

    The University of Wisconsin has completed fabrication and commissioning of a low frequency (199.6 MHz) superconducting electron gun based on a quarter wave resonator (QWR) cavity. Its concept was optimized to be the source for a CW free electron laser facility. The gun design includes active tuning and a high temperature superconducting solenoid. We will report on the status of the Wisconsin SRF electron gun program, including commissioning experience and first beam measurements.

  4. Electron Trapping by Molecular Vibration

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    Electron Trapping by Molecular Vibration Electron Trapping by Molecular Vibration Print Wednesday, 27 April 2005 00:00 In photoelectron spectroscopy experiments performed at the ALS, a group of researchers has found that electronic transitions normally thought to be forbidden can in fact be excited in conjunction with certain types of molecular vibrations. Specifically, they found that when the symmetry of a linear triatomic molecule is broken by asymmetric vibrational modes, photoelectrons can

  5. Ion plated electronic tube device

    DOE Patents [OSTI]

    Meek, T.T.

    1983-10-18

    An electronic tube and associated circuitry which is produced by ion plating techniques. The process is carried out in an automated process whereby both active and passive devices are produced at very low cost. The circuitry is extremely reliable and is capable of functioning in both high radiation and high temperature environments. The size of the electronic tubes produced are more than an order of magnitude smaller than conventional electronic tubes.

  6. Electronic field permeameter

    DOE Patents [OSTI]

    Chandler, Mark A.; Goggin, David J.; Horne, Patrick J.; Kocurek, Gary G.; Lake, Larry W.

    1989-01-01

    For making rapid, non-destructive permeability measurements in the field, a portable minipermeameter of the kind having a manually-operated gas injection tip is provided with a microcomputer system which operates a flow controller to precisely regulate gas flow rate to a test sample, and reads a pressure sensor which senses the pressure across the test sample. The microcomputer system automatically turns on the gas supply at the start of each measurement, senses when a steady-state is reached, collects and records pressure and flow rate data, and shuts off the gas supply immediately after the measurement is completed. Preferably temperature is also sensed to correct for changes in gas viscosity. The microcomputer system may also provide automatic zero-point adjustment, sensor calibration, over-range sensing, and may select controllers, sensors, and set-points for obtaining the most precise measurements. Electronic sensors may provide increased accuracy and precision. Preferably one microcomputer is used for sensing instrument control and data collection, and a second microcomputer is used which is dedicated to recording and processing the data, selecting the sensors and set-points for obtaining the most precise measurements, and instructing the user how to set-up and operate the minipermeameter. To provide mass data collection and user-friendly operation, the second microcomputer is preferably a lap-type portable microcomputer having a non-volatile or battery-backed CMOS memory.

  7. Polyplanar optical display electronics

    SciTech Connect (OSTI)

    DeSanto, L.; Biscardi, C.

    1997-07-01

    The Polyplanar Optical Display (POD) is a unique display screen which can be used with any projection source. The prototype ten inch display is two inches thick and has a matte black face which allows for high contrast images. The prototype being developed is a form, fit and functional replacement display for the B-52 aircraft which uses a monochrome ten-inch display. In order to achieve a long lifetime, the new display uses a 100 milliwatt green solid-state laser (10,000 hr. life) at 532 nm as its light source. To produce real-time video, the laser light is being modulated by a Digital Light Processing (DLP{trademark}) chip manufactured by Texas Instruments. In order to use the solid-state laser as the light source and also fit within the constraints of the B-52 display, the Digital Micromirror Device (DMD{trademark}) circuit board is removed from the Texas Instruments DLP light engine assembly. Due to the compact architecture of the projection system within the display chassis, the DMD{trademark} chip is operated remotely from the Texas Instruments circuit board. The authors discuss the operation of the DMD{trademark} divorced from the light engine and the interfacing of the DMD{trademark} board with various video formats (CVBS, Y/C or S-video and RGB) including the format specific to the B-52 aircraft. A brief discussion of the electronics required to drive the laser is also presented.

  8. Advance Electronics | Open Energy Information

    Open Energy Info (EERE)

    transient suppressors, automatic voltage stablisers, voltmeters oscilloscopes, and signal generators. References: Advance Electronics1 This article is a stub. You can help...

  9. Tyco Electronics | Open Energy Information

    Open Energy Info (EERE)

    Product: Pennsylvania-based passive component manufacturer. The firm produces power storage devices. References: Tyco Electronics1 This article is a stub. You can help OpenEI...

  10. Genesis Electronics | Open Energy Information

    Open Energy Info (EERE)

    Solar Product: Technology company, focusing on consumer applications for solar energy and alternative energy sources. References: Genesis Electronics1 This article is a stub. You...

  11. Solar wind thermal electron distributions

    SciTech Connect (OSTI)

    Phillips, J.L.; Gosling, J.T.

    1991-01-01

    Solar wind thermal electron distributions exhibit distinctive trends which suggest Coulomb collisions and geometric expansion in the interplanetary magnetic field play keys roles in electron transport. We introduce a simple numerical model incorporating these mechanisms, discuss the ramifications of model results, and assess the validity of the model in terms of ISEE-3 and Ulysses observations. Although the model duplicates the shape of the electron distributions, and explains certain other observational features, observed gradients in total electron temperature indicate the importance of additional heating mechanisms. 5 refs., 7 figs.

  12. Cookson Electronics | Open Energy Information

    Open Energy Info (EERE)

    Place: Providence, Rhode Island Zip: 2903 Product: Rhode Island-based materials science company. The division produces PV junction boxes. References: Cookson Electronics1...

  13. Deep Inelastic Electron Scattering: Experimental

    DOE R&D Accomplishments [OSTI]

    Friedman, J. I.

    1971-10-01

    This report reviews and brings up to date the experimental information on high energy inelastic electron scattering from proton and neutron.

  14. Electron Trapping by Molecular Vibration

    Broader source: All U.S. Department of Energy (DOE) Office Webpages (Extended Search)

    that has not been observed previously but appears to be widespread. Such coupling between electronic motion and nuclear motion becomes increasingly important as scientists learn...

  15. Pyramidal inversion domain boundaries revisited

    SciTech Connect (OSTI)

    Remmele, T.; Albrecht, M.; Irmscher, K.; Fornari, R.; Strassburg, M.

    2011-10-03

    The structure of pyramidal inversion domain boundaries in GaN:Mg was investigated by aberration corrected transmission electron microscopy. The analysis shows the upper (0001) boundary to consist of a single Mg layer inserted between polarity inverted GaN layers in an abcab stacking. The Mg bound in these defects is at least one order of magnitude lower than the chemical Mg concentration. Temperature dependent Hall effect measurements show that up to 27% of the Mg acceptors is electrically compensated.

  16. following an electron bunch for free electron laser

    SciTech Connect (OSTI)

    2012-01-01

    A video artist's ultra-slow-motion impression of an APEX-style electron gun firing a continuous train of electron bunches into a superconducting linear accelerator (in reality this would happen a million times a second). As they approach the speed of light the bunches contract, maintaining beam quality. After acceleration, the electron bunches are diverted into one or more undulators, the key components of free electron lasers. Oscillating back and forth in the changing magnetic field, they create beams of structured x-ray pulses. Before entering the experimental areas the electron bunches are diverted to a beam dump. (Animation created by Illumina Visual, http://www.illuminavisual.com/, for Lawrence Berkeley National Laboratory. Music for this excerpt, "Feeling Dark (Behind The Mask)" is by 7OOP3D http://ccmixter.org/files/7OOP3D/29126 and is licensed under a Creative Commons license: http://creativecommons.org/licenses/by-nc/3.0/)

  17. VDE Association for Electrical Electronic Information Technologies...

    Open Energy Info (EERE)

    VDE Association for Electrical Electronic Information Technologies Jump to: navigation, search Name: VDE (Association for Electrical, Electronic & Information Technologies) Place:...

  18. Electronic Status Board

    Energy Science and Technology Software Center (OSTI)

    2004-06-02

    This software was developed to post real-time process status and building conditions to operators, system engineers, system managers, and all support personnel. Data input is via operator console, strategically located throughout the facility, or by electronic rounds tablet. The system requires a person to log in with a unique user id and password to edit data. Viewing system status does not require log in and can be done from any desktop location running FileMaker. Oncemore » logged into the system, all new records saved are stamped with date, time and user name, and a historical copy is created that can be brought up to review status. There is no limitation to the amount of records that can be saved in the historical databases. The system will flag all out of limit conditions on the screen and enter that record on a turnover summery page which displays only flagged items. System conditions are displayed on a plasma display which scrolls through the various system condition screens. The system also shows floor plans that reflect specific building radiological conditions which aides in pre job briefings to show all hazards to personnel entering specific locations. The input screen is displayed on a second standard computer monitor connected to the input PC. There are several popup screens that require user intervention to ensure that the user wants to edit the data, is editing the appropriate sytem, and if they want to continue to stay logged into the system. Each workstation is connected to a Uninterrupted Power Supply which will shut each system down safely in a power failure. The server is configured to print out current status upon notification from the UPS that power has failed. The system also has a video input card which is connected to a DVD/VCR which shows safety meetings, and images taken from a digital camera used to show specific locations/items for pre-job briefings.« less

  19. The electron geodesic acoustic mode

    SciTech Connect (OSTI)

    Chakrabarti, N. [Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Calcutta 700 064 (India); Guzdar, P. N. [Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20742 (United States); Kaw, P. K. [Institute for Plasma Research Bhat, Gandhinagar 382428 (India)

    2012-09-15

    In this report, a novel new mode, named the electron geodesic acoustic mode, is presented. This mode can occur in toroidal plasmas like the conventional geodesic acoustic mode (GAM). The frequency of this new mode is much larger than that of the conventional GAM by a factor equal to the square root of the ion to electron mass ratio.

  20. ILC Electron Source Injector Simuations

    SciTech Connect (OSTI)

    Lakshmanan, Manu; /Cornell U., LNS /SLAC

    2007-08-29

    As part of the global project aimed at proposing an efficient design for the ILC (International Linear Collider), we simulated possible setups for the electron source injector, which will provide insight into how the electron injector for the ILC should be designed in order to efficiently accelerate the electron beams through the bunching system. This study uses three types of software: E-Gun to simulate electron beam emission, Superfish to calculate solenoidal magnetic fields, and GPT (General Particle Tracer) to trace charged particles after emission through magnetic fields and subharmonic bunchers. We performed simulations of the electron source injector using various electron gun bias voltages (140kV - 200kV), emitted beam lengths (500ps - 1ns) and radii (7mm - 10mm), and electromagnetic field strengths of the first subharmonic buncher (5 - 20 MV/m). The results of the simulations show that for the current setup of the ILC, a modest electron gun bias voltage ({approx}140kV) is sufficient to achieve the required bunching of the beam in the injector. Extensive simulations of parameters also involving the second subharmonic buncher should be performed in order to gain more insight into possible efficient designs for the ILC electron source injector.