
- 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim p s scurrent topics in solid state physics
- Photonic Crystal Defects with Increased Surface Area for Improved Refractive Index Sensing
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- 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Phys. Status Solidi A 206, No. 6, 13651368 (2009) / DOI 10.1002/pssa.200881097
- As featured in: www.rsc.org/materials
- Active Photonic Crystals, edited by Sharon M. Weiss, Ganapathi S. Subramania, Florencio Garcia-Santamaria Proc. of SPIE Vol. 6640, 6640C, (2007) 0277-786X/07/$18 doi: 10.1117/12.736193
- Sixth International Conference on Solid State Lighting, edited by Ian T. Ferguson, Nadarajah Narendran, Tsunemasa Taguchi, Ian E. Ashdown,
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- 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Phys. Status Solidi A 206, No. 6, 13391342 (2009) / DOI 10.1002/pssa.200881114
- Author's personal copy Current status and outlook for silicon-based optical biosensors
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- 596 IEEE TRANSACTIONS ON NANOTECHNOLOGY, VOL. 9, NO. 5, SEPTEMBER 2010 Size-Dependent Infiltration and Optical Detection
- Tunable photonic bandgap structures for optical interconnects S.M. Weiss a,*, M. Haurylau b
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- DNA Oligonucleotide Synthesis in Mesoporous Silicon for Biosensing Applications
- Photonic crystal defect tuning for optimized light-matter interaction Christopher Kang a,b
- Reflectance analysis of a multilayer one-dimensional porous silicon structure: Theory and experiment
- Copyright (c) 2009 IEEE. Personal use is permitted. For any other purposes, Permission must be obtained from the IEEE by emailing pubs-permissions@ieee.org. This article has been accepted for publication in a future issue of this journal, but has not been
- Characterization of boron charge traps at the interface of Si/SiO2 using second harmonic generation
- 1514 IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, VOL. 12, NO. 6, NOVEMBER/DECEMBER 2006 Porous Silicon One-Dimensional Photonic Crystals
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- Boron induced charge traps near the interface of Si/SiO2 probed by second harmonic generation
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- Diffusion dynamics of small molecules from mesoporous silicon films by real-time
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