- Auton Robot (2007) 23: 197212 DOI 10.1007/s10514-007-9042-y
- IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 13, NO. 1, FEBRUARY 2008 95 A Piezo-Sensor-Based "Smart Tire" System
- IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, VOL. 4, NO. 4, OCTOBER 2007 569 Bottleneck Station Scheduling in Semiconductor
- 456 IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 14, NO. 4, AUGUST 2009 Disturbance-Observer-Based Hysteresis
- IEEE SENSORS JOURNAL, VOL. 9, NO. 7, JULY 2009 731 A Vibration-Based PMN-PT Energy Harvester
- IEEE TRANSACTIONS ON ROBOTICS, VOL. 25, NO. 5, OCTOBER 2009 1087 Kinematic Modeling and Analysis of Skid-Steered
- hemical-mechanical planarization (CMP) is an abrasive process for polishing the surfaces of
- 384 IEEE SENSORS JOURNAL, VOL. 8, NO. 4, APRIL 2008 A PVDF-Based Deformation and Motion Sensor
- IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, VOL. 5, NO. 2, APRIL 2008 321 Steady-State Throughput and Scheduling Analysis of
- IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 19, NO. 3, AUGUST 2006 339 Multicluster Tools Scheduling: An Integrated Event
- Macroscopic traffic flow propagation stability for adaptive cruise controlled vehicles
- IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 18, NO. 3, AUGUST 2005 371 On the Wafer/Pad Friction of ChemicalMechanical
- Broadband optical end-point detection for linear chemicalmechanical planarization
- IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 16, NO. 4, NOVEMBER 2003 609 Neural Network Based Uniformity Profile Control of
- Intel Serv Robotics (2009) 2:219231 DOI 10.1007/s11370-009-0046-7
- IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 18, NO. 3, AUGUST 2005 359 On the Wafer/Pad Friction of ChemicalMechanical
