Gidley, David - Department of Physics, University of Michigan

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Gidley, David - Department of Physics, University of Michigan

Depth-profiling plasma-induced densification of porous low-k thin films using positronium annihilation lifetime spectroscopy
Molecular Templating of Nanoporous Ultralow Dielectric Constant (1.5)
Characterizing Porosity in Nanoporous Thin Films Using Positronium Annihilation Lifetime Spectroscopy
Determination of Pore Size in Mesoporous Thin Films from the Annihilation Lifetime of Positronium
Radiation Physics and Chemistry 68 (2003) 351356 Characterization of nanoporous ultra low-k thin films
Positronium annihilation in mesoporous thin films D. W. Gidley and W. E. Frieze
Probing diffusion barrier integrity on porous silica low-k thin films using positron annihilation lifetime spectroscopy
VOLUME 78, NUMBER 8 P H Y S I C A L R E V I E W L E T T E R S 24 FEBRUARY 1997 Interface and Surface Effects on the Glass Transition in Thin Polystyrene Films
18 Jan 2006 10:5 AR ANRV279-MR36-02.tex XMLPublishSM(2004/02/24) P1: IKH AR REVIEWS IN ADVANCE10.1146/annurev.matsci.36.111904.135144
The Preparation and Characterization of Small Mesopores in Siloxane-Based Materials That Use Cyclodextrins as Templates
A Broad Perspective on the Dynamics of Highly Confined Polymer Films Christopher L. Soles, Jack F. Douglas, Wen-li Wu, Huagen Peng1
Radiation Physics and Chemistry 68 (2003) 345349 Characterizing porosity in nanoporous thin films using
How Pore Size and Surface Roughness Affect Diffusion Barrier Continuity on Porous Low-k Films
Nanoporous Ultralow Dielectric Constant Organosilicates Templated by Triblock Copolymers
Effect of material properties on integration damage in organosilicate glass films
Determination of pore-size distribution in low-dielectric thin films D. W. Gidleya)
Mat. Res. Soc. Symp. Proc. Vol. 612 2000 Materials Research Society Probing Pore Characteristics in Low-K Thin Films Using Positronium Annihilation