- IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 55, NO. 6, JUNE 2008 1547 A Statistical Reliability Model for
- IEEE TRANSACTIONS ON NANOTECHNOLOGY, VOL. 6, NO. 3, MAY 2007 303 Reliability-Driven Gate Replication for
- Power efficient multi-stage CMOS rectifier design for UHF RFID tags$ Shu-Yi Wong, Chunhong Chen n
- 836 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 10, NO. 6, DECEMBER 2002 Probability-Based Approach to Rectilinear Steiner
- 100 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS--II: EXPRESS BRIEFS, VOL. 53, NO. 2, FEBRUARY 2006 A Low-Power CMOS Analog Multiplier
- 338 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 19, NO. 2, FEBRUARY 2011 Low Power Chien Search for BCH Decoder
- RESEARCHARTICLE Copyright 2011 American Scientific Publishers
