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Yoo, SukIn - School of Computer Science and Engineering, Seoul National University
IEICE TRANS. INF. & SYST., VOL.Exx??, NO.xx XXXX 200x Automatic Detection of Region-Mura Defect in TFT-LCD
Version Space Learning with DNA Molecules Hee-Woong Lim1
Journal of Intelligent Information Systems, 16, 520, 2001 c 2001 Kluwer Academic Publishers. Manufactured in The Netherlands.
