- Reprinted from J OURNAL OF THE OPTICAL SOCIETY OF AMERICA , Vol. 58, No. 3, 357-361, March 1968 Printed in U. S. A.
- 6. Measurement of Surface Quality 6.1 View transmitted or reflected light
- I am using the star test to evaluate an optical system. How does the minimum blur diameter due to third-order spherical aberration compare to
- Energy distribution in a scatterplate interferometer Lawrence F. Rubin and James C. Wyant
- Advances in Interferometric Metrology James C. Wyant
- Fringe Modulation Characterization for a Phase Shifting Imaging Ellipsometer
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- 2003 -James C. Wyant Page 1 of 8 State-of-the-Art Direct Phase
- Determination of the dihedral angle errors of a corner cube from Twyman-Green interferogram
- Testing an optical window of a small wedge angle: effect of multiple reflections
- JOURNAL OF THE OPTICAL SOCIETY OF AMERICA VOLUME 59. NUMBER 12 DECEMBER 1969 Effects of Photographic Gamma on Hologram Reconstructions*
- Effectof retroreflection on a Fizeau phase-shifting interferometer
- Optics 505 -James C. Wyant Optics 505 -James C. Wyant Part 9 Page 1 of 36
- Volume 19, number 1 Optics COMMUNICATIONS October 1976 A SIMPLE INTERFEROMETRIC MTF INSTRUMENT
- Undesired Light in a Reconstructed Hologram Image Caused by the Nonlinearity of the Photographic Process
- (Fringes of Equal Chromatic Order) FECO (Fringes of Equal Chromatic Order)
- A Practical Implementation of the Random Ball Test Robert E. Parks
- Geometric Phase Shifter Initial Parameter Setup
- Modern Approaches in Phase Measuring Metrology James Millerd, Neal Brock, John Hayes, Brad Kimbrough, Matt Novak, Michael North-Morris and
- 2.0 QUALIFICATION OF OPTICAL MATERIAL James C. Wyant
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- Measurement of surface topography of magnetic tapes by Mirau interferometry
- Interferometry James C. Wyant
- Fringe modulation skewing effect in white-light vertical scanning interferometry
- Polarization phase-shifting point-diffraction interferometer Robert M. Neal and James C. Wyant
- Light Distribution Near Focus Diagram showing notation for diffraction of a converging wave at a
- March 4, 1997 1) (25 Pts) A linearly polarized source is used with a Twyman-Green interferometer. A
- Int. J. Mach. Tools Manufact. Vol. 38. Nos 5 6, pp. 691 698, 1998 1998 Elsevier Science Ltd. All rights reserved
- Optics 513 Exam #1 October 11, 2005
- Optical and mechanical design considerations in the construction of a 24" phase shifting interferometer Joe Lamb, James Semrad, James Wyant, Chiayu Ai,
- 8. Multilayer Films Optical surfaces having virtually any desired reflectance and transmittance characteristics may be
- Dynamic Interferometry Neal Brock*, John Hayes*, Brad Kimbrough, James Millerd*, Michael North-Morris*
- Reprinted from Applied Optics, Vol. 20, page 235, January 15,198l Copyright 1981 by the Optical Society of America and reprinted by permission of the copyright owner.
- Reprinted from OPTICS LETTERS, Vol. 3, page 118, September 1978 Copyright 1978 by the Optical Society of America and reprinted by permission of the copyright owner.
- Phase shifter calibration in phase-shifting interferometry Yeou-Yen Cheng and James C. Wyant
- Birefringent Scatterplate Phase Shifting Interferometer Michael North-Morris, Jay Van Delden, James C. Wyant
- Int. J. Mach. Tools Manufact. Vol. 32, No. 1/2, pp. 5-10, 1992. 0890-6955/9255.00 + .00 Printed in Great Britain Pergamon Press plc
- Phase-Shifting Interferometry 1.1 Hyperlinks
- James C. Wyant Absolute Testing
- Advances in Interferometric Surface Measurement James C. Wyant
- Today, with the introduction of more powerful minicomputers and micropro-
- Testing stress birefringence of an optical window James C. Wyant
- Phase-shifting birefringent scatterplate interferometer
- 9.3 Non-null Test Can use geometrical tests such as Foucault, wire, or Ronchi tests, but we will only
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- Measurement of the inhomogeneity of a window WYKO Corporation
- Offset of coherent envelope position due to phase change on reflection
- Fraunhofer Diffraction Pattern of Multi-Experimental Diagram
- Optics 505 -James C. Wyant -8 -6 -4 -2 0 2 4 6 8
- REAL TIME PHASE CORRECTION OF OPTICAL IMAGING SYSTEMS
- Improved vertical-scanning interferometry Akiko Harasaki, Joanna Schmit, and James C. Wyant
- Reprinted from APPLIED OPTICS, Vol. 17, page 3034, October 1, 1978 Copyright 1978 by the Optical Society of America and reprinted by permission of the copyright owner.
- Reprinted from OPTICS LETTERS, Vol. 1, page 130, October 1977 Copyright 1977 by the Optical Society of America and reprinted by permission of the copyright owner
- Reprinted from APPLIED OPTICS, Vol. 14, page 142, January 1975 Copyright 1975 by the Optical Society of America and reprinted by permission of the copyright owner
- A Simple Ball Averager for Reference Sphere Calibrations Ulf Griesmann, Quandou Wang, Johannes Soons, and Remi Carakos
- Absolute measurement of surface roughness Katherine Creath and James C. Wyant
- Reprinted from APPLIED OPTICS, Vol. 13, page 1549, July 1974 Copyright 1974 by the Optical Society of America and reprinted by permission of the copyright owner
- Calibration of Interferometer Transmission Spheres Robert E Parks
- Instantaneous phase-shifted Speckle Interferometer for measurement of large optical structures
- Reprinted from APPLIED OPTICS, Vol. 14, page 2622, November 1975 Copyright 1975 by the Optical Society of America and reprinted by permission of the copyright owner
- Optics 505 -James C. Wyant Optics 505 -James C. Wyant Chapter 17 Page 1 of 28
- Reprinted from APPLIED OPTICS. Vol. 10, page 2113, September 1971 Copyright 1971 by the Optical Society of America and reprinted by permission of the copyright owner
- Dlrect phase neaaurement of eapherlc aurface contours Katherine Creath and James C. Wyant
- Vibration CompensatedVibration Compensated InterferometersInterferometers
- Directcomparisonof mechanicalandopticalmeasurements of the finishof precisionmachinedopticalsurfaces
- APPLICATIflNSDETHflLflGRAPHIE ComptesrendusduSymposiumInternational
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- Two-wavelength holographic interferometer Philip Lam, J. D. Gaskill, and James C. Wyant
- Real-time optical subtraction of photographic imagery for difference detection
- 5.6 Spatial Synchronous and Fourier Methods Both techniques use a single interferogram having a large amount of tilt.
- Reprinted from APPLIED OPTICS, Vol. 13, page 1904, May 1974 Copyright 1974 by the Optical Society of America and reprinted by permission of the copyright owner
- Invited Paper Comparison of surface roughness measured
- Reprinted from APPLIED OPTICS, Vol. 12, page 2057, September 1973 Copyright 1973 by the Optical Society of America and reprinted by permission of the copyright owner
- Optics 513 Exam #1 October 11, 2007
- 7. Multiple Beam Interference 7.1 Airy's Formula
- 8.0 Curved Surfaces and/or Lenses 8.1 Radius of Curvature
- Absolute Measurement of Surface Roughness James C. Wyant and Katherine Creath
- 009t$/OO/X98L-LLO(ooo)coiIOA3IdS40S6U!pGG3Oid'SJO!p3 'uesqoerJd'e6pIJupjoeJ99sewer'swewnijsujpuesedoose,ejeoedSdIpu'eojd'UI9Z9
- 2007 -James C. Wyant Chapter 4 Page 1 of 29 4. Basic Interferometry and Optical Testing
- Transfer function characterization of laser Fizeau interferometer for high spatial frequency phase measurements
- Absolute testing of flats by using even and odd functions
- Testingspherical surfaces: afast, quasi-absolute Katherine Creath and James C. Wyant
- Absolute testing of flats decomposed to even and odd functions
- Reprinted from Applied Optics, Vol. 19, page 1862, June 1, 1980 Copyright 1980 by the Optical Society of America and reprinted by permission of the copyright owner.
- Wear, 122 (1988) 301-312 301 A NEW THREE-DIMENSIONAL NON-CONTACT
- J. C. Wyant C. L. Koliopoulos
- Use of a symbolic math system to solve polarized light problems
- Reprinted from APPLIED OPTICS, Vol. 17, page 1853, June 15,1978 Copyright 1978 by the Optical Society of America and reprinted by permission of the copyright owner.
- Reprinted from APPLIED OPTICS, Vol. 14, page 1057, May 1975 Copyright 1975 by the Optical Society of America and reprinted by permission of the copyright owner
- APPLIED OPTICS AND OPTICAL ENGINEERING, VOL. Xl Basic Wavefront Aberration Theory
- WhiteLightInterferometry JamesC. Wyant
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- Optics 513L -James C. Wyant (2008) Optics 513L -Optical Testing and Testing
- Reprinted from APPLIED OPTICS, Vol. 14, page 1607, July 1975 Copyright 1975 by the Optical Society of America and reprinted by permission of the copyright owner
- 9. Special Interferometric Tests for Aspherical Surfaces 9.1 Description of aspheric surfaces
- F&printed from APPLIED OPTICS, Vol. 13, page 2762, December 1974 Copyright 1974 by the Optical Society of America and reprinted by permission of the copyright owner
- Optics 513 Exam #1 October 10, 2006
- 8.2.15) Lateral Shear Test In a lateral shear interferometer the wavefront to be tested, W(x,y), is interfered with a
- Digital Holography Nondestructive James C. Wyant
- Moir and Fringe Projection Techniques K. Creath and J. C. Wyant
- Fraunhofer Diffraction Pattern of Rect-angular Aperture
- SPIE Gold Medal ocusanddedication--oftentotheexclusion
- February 26, 1998 1) A 633 nm wavelength linearly polarized source is used with a Young's two pinhole
- February 25, 1999 1) a) (5 Pts) Suppose a half-wave plate is rotated at a rate between stationary crossed
- April 10, 1997 1) The characteristic matrix is very useful in analyzing multilayer films.
- April 9, 1998 1) (10 Pts) Determine the refractive index and thickness of a film to be deposited on a
- James C. Wyant Optics 505 Page 1 of 2
- 3.0 Wave Equation In deriving the wave equation we will first make use of the vector identity
- Reference Optics by Hecht Equation of Ellipse
- Basic Interference and Classes of Interferometers -James C. Wyant Optics 505 -James C. Wyant Page 1 of 26
- 13 Fresnel Diffraction In this section we will look at the Fresnel diffraction for both circular apertures and rectangular apertures. To
- Fraunhofer Diffraction Pat-tern of Circular Aperture
- Optics 505 -James C. Wyant Optics 505 -James C. Wyant Chapter 18 Page 1 of 15
- 1.0 MEASUREMENT OF PARAXIAL PROPERTIES OF OPTICAL SYSTEMS
- APPLIED OPTICS AND OPTICAL ENGINEERING, VOL. Xl Basic Wavefront Aberration Theory
- Zernike Polynomials 1 Introduction
- Jones Calculus Jones Vectors
- Invited Paper Comparison of surface roughness measured
- Extended Range Two-Wavelength Interferometry
- 8. Testing of Curved Surfaces and/or Lenses 8.1 Radius of Curvature
- Energy distribution in a scatterplate interferometer Lawrence F. Rubin and James C. Wyant
- Non-Interferometric Testing Introduction
- Density and Phase Knife-Edge We will look at the Fresnel diffraction pattern for both a
- White Light Grating Interferometer Separation between +1 and 1 orders is proportional to
- One-Dimensional Analysis of Lateral Shearing Interferograms
- 11. System Evaluation 11.1 Resolution Tests
- Optics 513L -James C. Wyant (2008) Optics 513L -Optical Testing and Testing
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- Optics 513L -James C. Wyant (2008) Optics 513 -Optical Testing and Testing
- 402 HOLOGRAPHIC AND MOIR TECHNIQUES 12.5. MOIR INTERFEROMETRY
- Aspherical mirror testing using a CGH with small errors
- Plotting errors measurement of CGH using an improved interferometric method
- Reprinted from APPLIED OPTICS, Vol. 10, page 619. March 1971 Copyright 1971 by the Optical Society of America and reprinted by permission of the copyright owner
- Low Coherence Vibration Insensitive Fizeau Interferometer Brad Kimbrough, James Millerd, James Wyant, John Hayes
- Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer
- Dynamic Interferometry Neal Brock*, John Hayes*, Brad Kimbrough, James Millerd*, Michael North-Morris*
- Instantaneous phase-shift, point-diffraction interferometer. James E. Millerd, Stephen J. Martinek, Neal J. Brock, John B. Hayes and James C. Wyant
- Pixelated Phase-Mask Dynamic Interferometer James Millerd, Neal Brock, John Hayes, Michael North-Morris, Matt Novak and James Wyant
- A phase shifting interferometeric imaging ellipsometer Conrad Weilsa and James C. Wyant
- Effect of spurious reflection on phase shift interferometry Chiayu Aiand James C. Wyant
- Effect of piezoelectric transducer nonlinearity on phase shift interferometry
- O P T I C A A C T A , 1985, V O L. 32, N O . 1 2 , 1 4 5 5 -1 4 6 4 Contouring aspheric surfaces using two-wavelength
- High precision deformation measurement by digital phase shifting holographic interferometry
- Direct phase measurement interferometer working at 3.8 m
- Multiple-wavelength phase-shifting interferometry Yeou-Yen Cheng and James C. Wyant
- Two-wavelength phase shifting interferometry Yeou-Yen Cheng and James C. Wyant
- Testing aspherics usingtwo-wavelength holography: use of digital electronic techniques
- Reprinted from APPLIED OPTICS, Vol. 13, page 200, January 1974 Copyright 1973 by the Optical Society of America and reprinted by permission of the copyright owner
- High Efficiency GratingLateral Short Communication
- Reprinted from APPLIED OPTICS, Vol. 14, page 1619, July 1975 Copyright 1975 by the Optical Society of America and reprinted by permission of the copyright owner
- Volume 11, number 3 OPTICS COMMUNICATIONS July 1974 DOUBLE GRATING INTERFEROMETER WITH VARIABLE LATERAL SHEAR
- Phase-Shifting Scatterplate Interferometer Michael North-Morris and James C. Wyant
- Errors Caused by Nearly Parallel Optical Elements in a Laser Fizeau Interferometer Utilizing Strictly Coherent Imaging
- Optical resolution of phase measurements of laser Fizeau interferometer Erik Novak, Chiayu Ai, and James C. Wyant
- Testing an optical window of a small wedge angle Chiayu Ai and James C. Wyant
- Invited Paper Computerized interferometric measurement
- Invited Paper Absolute Measurement of Spherical Surfaces
- 5. Direct-Phase Measurement Interferometry 5.1 Phase Shifters
- 1998 -James C. Wyant Page 1 of 24 White Light Interferometry
- April 13, 1999 1) a) (10 Pts) How many elements are in the characteristic matrix?
- 7. Testing Flat Surface Optical Components 7.1 Mirrors
- Instantaneous phase-shift, point-diffraction interferometer. James E. Millerd, Neal J. Brock, John B. Hayes and James C. Wyant
- 4.0 Basic Interferometry and Optical Testing
- Optics 513 Exam #1 October 21, 2008
- Mathematica items initially needed Phase-Shifting Interferometry
- Jones Calculus Jones Vectors
- 5.7 Multiple Wavelength and White Light Phase-Shifting
- 5.0 Direct Phase Measurement Interferometry
- 2.0 QUALIFICATION OF OPTICAL MATERIAL James C. Wyant
- 5.6 Phase-Shifting Nondestructive Testing
- Spatial Synchronous and Fourier Methods Both techniques use a single interferogram having a large amount of tilt.
- 5.8 Vertical Scanning (Coherence Probe) Techniques
- Slide 1 of 16 Geometric Phase Shifter
- 1.0 MEASUREMENT OF PARAXIAL PROPERTIES OF OPTICAL SYSTEMS
