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Aihara, Hiroaki - Department of Physics, University of Tokyo
The Belle Silicon Vertex Detector Hiroaki Aihara
Test results of VA1 fabricated by sub-micron Masashi Yokoyama
For Publisher's use A MEASUREMENT OF CP VIOLATION IN B 0 MESON DECAYS AT BELLE
Test results of VA1 fabricated by submicron Masashi Yokoyama
Radiation-hardness of VA1 with Sub-micron Process Technology
The Belle Silicon Vertex Detector Hiroaki Aihara
15 January 2003 Proper-time Resolution Function for
For Publisher's use MEASUREMENTS OF HEAVY MESON LIFETIMES WITH BELLE
For Publisher's use A MEASUREMENT OF CP VIOLATION IN B0
For Publisher's use MEASUREMENTS OF HEAVY MESON LIFETIMES WITH BELLE
PHYSICS RESULTS FROM BELLE Department of Physics, University of Tokyo, Tokyo 1130033, Japan
