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Hayes, John P. - Department of Electrical Engineering and Computer Science, University of Michigan
ILIA POLIAN ET AL. 1 Modeling and Mitigating Transient Errors in
Time-Constrained Failure Diagnosis in Distributed Embedded Systems
EECS 579: Digital System Testing FALL 2010 UNIVERSITY OF MICHIGAN
Probabilistic Transfer Matrices in Symbolic Reliability Analysis of Logic Circuits
Quantum Information and Computation, Vol. 8, No. 3&4 (2008) 02820294 c Rinton Press
Modeling and Mitigating Transient Errors in Logic Circuits
