- To predict the difficulty of testing a wire stuckat fault, testability analysis algorithms provide an esti
- November 5, 1999 1 Reducing Test Application Time by Scan
- A TreeStructured LFSR Synthesis Scheme for PseudoExhaustive Testing of VLSI Circuits
- Efficient Boolean Division and Substitution ShihChieh Chang David Ihsin Cheng
- Generally, there exist randompattern resistant faults that result in the poor fault coverage in BuildIn SelfTesting
- Efficient Boolean Division and Substitution Using Redundancy Addition and Removing
- (which are commands in SIS) and compare the factored lit eral count with SIS and HANNIBAL. Column 2 shows the
- An Timing Driven Pseudo Exhaustive Testing for VLSI Circuits
- In this paper, we discuss the problem of optimizing a multi-level logic combinational Boolean network. Our techniques
- Circuit Optimization by Rewiring February 1,1999 1 Circuit Optimization by Rewiring
- x 1 x 2 x 3 x 4 x 5 Fig 1.a Fig 1.b Fig 1.c
- Proof. omitted. 4.2 The Interference Effect
- Perturb and Simplify: Multilevel Boolean Network OptimizerMarch 10, 1997 1 Perturb and Simplify: Multilevel Boolean
- The size of ROBDD is essential in many applications. In this paper, we propose a heuristic that minimizes ROBDD
- Postlayout Logic Restructuring Using Alternative Wires June 2, 1997 25 Fig. 1 Example of alterative wires
- TAIR: Testability Analysis by Implication Reasoning ShihChieh Chang, WenBen Jone, and ShiSen Chang
- On Removing Multiple Redundancies in Combinational Circuits ShihChieh Chang David Ihsin Cheng ChingWei Yeh
- After that, we applied our logic optimizer to the resulting circuits. The results of some MCNC benchmarks are
- 3. Apply maximum matching on a graph whose nodes correspond to mergeble functions and edges
- Because there are 6 IMP_OR nodes with 2 input edges in the fanin IFG of Fig. 8(a), we can derive 2 6 degenerated IFGs. One
