- VOLUME 75, NUMBER 14 P H Y S I C A L R E V I E W L E T T E R S 2 OCTOBER 1995 Template Structure at the Silicon/Amorphous-Silicide Interface
- Speckle in coherent x-ray reflectivity from Si,,111... wafers J. L. Libbert
- UHVCXDExperimentonPb GroupMeeting
- Surface Science 412/413 (1998) 374383 Formation of well-ordered surface compounds by coadsorption of
- Properties of an electrochemically deposited Pb monolayer on Cu,,111... Yong S. Chu and Ian K. Robinson
- Resonant Xray Diffraction Search for Nonstoichiometric Chemically Ordered
- VOLUME 78, NUMBER 18 P H Y S I C A L R E V I E W L E T T E R S 5 MAY 1997 Surface-Induced Giant Anisotropy in the Order Parameter Relaxation at Cu3Au(001)
- Coherent x-ray diffraction imaging of silicon oxide growth I. K. Robinson and J. L. Libbert
- Structure of Cu,,115...: Clean surface and its oxygen-induced facets D. A. Walko* and I. K. Robinson
- Surface Science 414 (1998) 159169 Surface atomic structure of the ( 3 3)R30-Sb
- Examining Phase Retrieval Stagnations in Coherent X-Ray Diffraction Patterns Lauren L. Perskie
- Local strain relaxation in Si0.7Ge0.3 on Si,,001... induced by Ga irradiation Chinkyo Kima)
- Imaging microstructure in crystals using coherent X-ray diffraction G.J. Williams
- Streaked Speckle in Cu 3 Au Coherent Xray Diffraction
- Three-dimensional imaging of deformation microstructure in gold nanocrystals
- Superstructure ordering in lanthanum-doped lead magnesium niobate D. M. Fanning and I. K. Robinsona)
- Phase Reconstruction of Quantum Dot X-ray Diffraction Patterns J. D. Onken
- VOLUME 74, NUMBER 11 P H Y S I C A L R E V I E W L E T T E R S 13 MARCH 1995 Thermodynamics of Surface Segregation Profiles at Cu3Au(001) Resolved by X-Ray Scattering
- VOLUME 75, NUMBER 3 P H Y S I C A L R E V I E W L E T T E R S 17 JULY 1995 X-Ray Photon Correlation Spectroscopy Study of Brownian Motion of Gold Colloids in Glycerol
- VOLUME 76, NUMBER 10 P H Y S I C A L R E V I E W L E T T E R S 4 MARCH 1996 Cs-Induced Relaxation of the Cu(110) Surface
- VOLUME 76, NUMBER 19 P H Y S I C A L R E V I E W L E T T E R S 6 MAY 1996 Comment on "In-Plane Lattice Reconstruction of
- Critical thickness of GaN thin films on sapphire (0001) Chinkyo Kima)
- Reconstruction of surface morphology from coherent x-ray reflectivity I. A. Vartanyants
- Compositional ordering in SiGe alloy thin films K. L. Whiteaker* and I. K. Robinson
- VOLUME 81, NUMBER 3 P H Y S I C A L R E V I E W L E T T E R S 20 JULY 1998 Surface Structure of a-Ga 010
- Surface Science 418 (1998) 295302 Domain-wall interactions in Bi/Cu(001)
- Comparison of aqueous and native oxide formation on Cu,,111... Y. S. Chu and I. K. Robinson
- Buffer layer strain transfer in AlN/GaN near critical thickness Chinkyo Kima)
- Surface Science 447 (2000) 187200 www.elsevier.nl/locate/susc
- Surface Review and Letters, Vol. 6, No. 5 (1999) 851857 c World Scientific Publishing Company
- Noise Immunity of Iterative Algorithms Used in Coherent Diffractive Imaging G.J. Williams
- Amethodforimagingmicrostructurefrom coherentX-raydiffractiondata
- VOLUME 83, NUMBER 4 P H Y S I C A L R E V I E W L E T T E R S 26 JULY 1999 Thickness Induced Buckling of bcc Copper Films
