Van Harlingen, Dale J. - Department of Physics, University of Illinois at Urbana-Champaign

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Van Harlingen, Dale J. - Department of Physics, University of Illinois at Urbana-Champaign

SUPERFLUID DENSITY MEASUREMENTS OF HIGH-TEMPERATURE SUPERCONDUCTING FILMS
Copyright by Joseph Edward Hilliard Jr., 2001 CONDUCTIVITY AND INTERFEROMETRY EXPERIMENTS ON YBCO/Pb RAMP-
P r o d u c t D a t a S h e e t Image Reversal
ELSEVIER Physica C 341-348 (2000) 1023-1026 www.elsevier.nl/Iocate/physc
Design of a scanning Josephson junction microscope for submicron-resolution magnetic imaging
Z .Physica C 317318 1999 410420 Extending SQUID interferometry beyond the cuprates and beyond
Fig. 1: Vortex distribution in 200nm a-MoGe square with no surface trenches, cooled in 30 mOe. Edge of square is near the right edge of the image. Image size = (508m)2
Integrated cryogenic scanning tunneling microscopy and sample preparation system
Vortex compression in surface trenches on superconducting films observed by Scanning SQUID Microscopy
Copyright by Brian David Yanoff, 2000 TEMPERATURE DEPENDENCE OF THE PENETRATION DEPTH IN THE
c Copyright by William K. Neils, 2002 JOSEPHSON INTERFEROMETRY MEASUREMENTS IN HIGH-TC GRAIN
CURRENT-PHASE RELATIONS OF JOSEPHSON JUNCTIONS WITH FERROMAGNETIC BARRIERS
c Copyright by Joseph Anthony Bonetti, 2002 FABRICATION AND ELECTRONIC TRANSPORT PROPERTIES OF
RAITH e-LiNE STEP-BY-STEP OPERATION INSTRUCTIONS written by MADALINA COLCI O'HARA
*Corresponding author. Fax: #1-217-244-8544. E-mail address: dvh@uiuc.edu (D.J. Van Harlingen)
DVH GROUP OFFICE HOME Dan Bahr 4-6007 721-0224
Imaging of magnetic vortices In superconducting networks and clusters by scanning SQUID microscopy