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- Transformed Pseudo-Random Patterns for BIST Nur A. Touba and Edward J. McCluskey
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- Copyright 1993 by the Center for Reliable Computing, Stanford University. All rights reserved, including the right to reproduce this report, or portions thereof, in any form.
- IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 14, NO. 6, JUNE 2006 587 Delay Testing of Partially Depleted
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- Copyright 1993 by the Center for Reliable Computing, Stanford University. All rights reserved, including the right to reproduce this report, or portions thereof, in any form.
- Inserting Test Points to Control Peak Power During Scan Testing Ranganathan Sankaralingam and Nur A. Touba
- Relating Entropy Theory to Test Data Compression Kedarnath J. Balakrishnan and Nur A. Touba
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- Paper 40.3 INTERNATIONAL TEST CONFERENCE 0-7803-9039-3/$20.00 2005 IEEE
- Copyright 1992 by the Center for Reliable Computing, Stanford University. All rights reserved, including the right to reproduce this report, or portions thereof, in any form.
- Input Ordering in Concurrent Checkers to Reduce Power Consumption
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- Nur A. Touba* and Edward J. McCluskey Center for Reliable Computing
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