- Detecting Malicious Inclusions in Secure Hardware: Challenges and Solutions
- The importance of within-die process variation and its impact on product yield has increased significantly with
- Quiescent Signal Analysis (QSA) is an IDDQ method for detecting defects that is based on the analysis of multiple
- In this paper we provide further evidence and verify the existence of convolution relation between transient currents of gates of a
- Securing Scan Design Using Lock & Key Technique Jeremy Lee, Mohammed Tehranipoor, Chintan Patel, and Jim Plusquellic
- An impedance profile of a commercial power grid and a tester power distribution system is developed in this paper.
- Defect-based Fault Simulation Model for iDDT Testing Abhishek Singh, Jim Plusquellic, Dhananjay Phatak and Chintan Patel
- Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multi-
- Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current
- Quiescent Signal Analysis (QSA) is a novel electri-cal-test-based diagnostic technique that uses IDDQ mea-
- Transient Signal Analysis (TSA) is a Go/No-Go device test-ing method that is based on the analysis of voltage tran-
- Paper 22.1 INTERNATIONAL TEST CONFERENCE 1 978-1-4244-7207-9/10/$26.00 2010 IEEE
- A delay-fault testing strategy based on the analysis of power supply transient signals is presented. The method is
- Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multi-
- IDDQ has been used extensively as a reliability screen for shorting defects in digital integrated cir-
- Quiescent Signal Analysis (QSA) is an IDDQ method for detecting defects that is based on the analysis of multiple
- Abstract --Metal resistance variations in back-end-of-line processes can be significant, particularly during process bring-up. In this paper, we propose a simple method to measure resistance variations
- IDDQ or steady state current testing has been extensively used in the industry as a mainstream defect detection and
- IDDQ or steady state current testing has been extensively used in the industry as a mainstream defect detection and
- At-Speed Transition Fault Testing With Low Speed Scan Enable Nisar Ahmed, C. P. Ravikumar
- Quiescent Signal Analysis (QSA) is a novel electri-cal-test-based diagnostic technique that uses IDDQ mea-
- A novel approach to testing CMOS digital circuits is pre-sented that is based on an analysis of IDD switching tran-
- A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time
- The finite, non-zero resistance of the metal wires that define the power grid of chips require the insertion of multiple ports
- Layout-Aware Scan-Cell Reordering for Improving Localized Switching to Detect Hardware Trojans
- For hardware security applications, the availability of secret keys is a critical component for secure activation, IC authentica-
- Securing Designs Against Scan-Based Side-Channel , Mohammad Tehranipoor
- A novel testing strategy is proposed that is designed to detect small delay defects by creating internal signal races.
- A procedure for localizing faults to specific gates using power supply transient signals is described. The method
- A Test Structure for Characterizing Local Device Mismatches Kanak Agarwal, Frank Liu, Chandler McDowell, Sani Nassif, Kevin Nowka,
- A Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel Attacks
- The large magnitude of background leakage currents in current technologies continues to reduce the effectiveness
- A Novel Framework for Functionally Untestable Transition Fault Avoidance during ATPG
- The power supply transient/quiescent signal (IDDT/IDDQ) methods that we propose for defect localization analyze
- In today's technologies, resistive shorting and open defects are becoming more predominant. Conventional fault mod-
- The power supply transient signal (IDDT) methods that we propose for defect detection and localization analyze
- Comparison of Branching CORDIC Implementations Abhishek Singh, Dhananjay S Phatak, Tom Goff, Mike Riggs, James Plusquellic and Chintan Patel
- Defect Diagnosis using a Current Ratio based Quiescent Signal Analysis Model for Commercial Power Grids
- A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing
- Transient Signal Analysis is a digital device testing method that is based on the analysis of volt-age transients at multiple test points. In this paper, the power supply transient signals from sim-
- Time and Frequency Domain Transient Signal Analysis for Defect Detection in CMOS Digital ICs
- We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of defects.
- Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multi-
- Output Waveform Analysis. In International Test Conference, pages 798807. IEEE, 1991.
- Quiescent Signal Analysis 2 0740-7475/06/$20.00 2006 IEEE Copublished by the IEEE CS and the IEEE CASS IEEE Design & Test of Computers
- Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multi-
- Trust in reference to integrated circuits addresses the concern that the design and/or fabrication of the IC may be purposely
- The power supply transient signal (IDDT) method that we propose for defect detection analyze regional signal variations
- Discussed is a circuit which measures and analyses power supply transients as defined in the test technique, Transient
- The use of IDDQ test as a defect reliability screen has been widely used to improve device quality. However, the
