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An Accurate Timing Model for Nano CMOS Circuit Considering Statistical Process Variation
 

Summary: An Accurate Timing Model for Nano CMOS Circuit
Considering Statistical Process Variation
Ping Liu, Yong-Bin Kim
Department of Electrical and Computer Engineering
Northeastern University
Boston, MA 02115
Email: {pliu, ybk }@ece.neu.edu
Young Jun Lee
Nextchip Company
Seoul, South Korea
Email: yjlee@nextchip.com
Abstract-- Process variation has more significant impact
on circuit performance as technology develops to nano
scale. It is therefore necessary to evaluate chip performance
using statistical timing analysis rather than deterministic
static timing analysis. This paper first evaluates the impact
of single extrinsic fluctuation on circuit performance based
on the rigorously derived propagation delay model. The
parameter fluctuations are characterized and a novel
statistical approach is developed to evaluate the effect of

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering