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VOLUME 77, NUMBER 20 P H Y S I C A L R E V I E W L E T T E R S 11 NOVEMBER 1996 Imaging the Dimers in Si 111 -7 3 7
 

Summary: VOLUME 77, NUMBER 20 P H Y S I C A L R E V I E W L E T T E R S 11 NOVEMBER 1996
Imaging the Dimers in Si 111 - 7 3 7
E. Bengu, R. Plass, and L. D. Marks
Department of Materials Science and Engineering, Northwestern University,
Evanston, Illinois 60208
T. Ichihashi, P. M. Ajayan,* and S. Iijima
NEC Corporation, Fundamental Research Labs,
Tsukuba, Ibariki 305, Japan
(Received 8 July 1996)
High resolution electron microscope images of the Si 111 - 7 3 7 surface in the plan-view geometry
have been analyzed, and the overlap of the top and bottom surfaces has been extracted numerically.
The resultant images show clearly not just the adatoms seen by scanning tunneling microscopy but all
the atoms in the top three layers, including the dimers in the third layer. [S0031-9007(96)01560-8]
PACS numbers: 68.35.Bs, 61.16.Bg, 79.60.Bm
The Si 111 - 7 3 7 surface is one of the most, if
not the most, complicated surface structure in existence.
A mystery for many years, the first reasonably accurate
structure model came from transmission electron diffrac-
tion data (TED) [1,2], assisted in part by the observa-
tion of adatoms by scanning tunneling microscopy (STM)

  

Source: Ajayan, Pulickel M. - Department of Mechanical Engineering and Materials Science, Rice University
Marks, Laurence D. - Department of Materials Science and Engineering, Northwestern University

 

Collections: Materials Science