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Summary: 340 IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VOL. 13, NO. 2, JUNE 2003
Imaging Local Sources of Intermodulation in
Superconducting Microwave Devices
A. P. Zhuravel, A. V. Ustinov, D. Abraimov, and Steven M. Anlage, Member, IEEE
Abstract--This work presents new experimental results on low-
temperature (LT) characterization of local rf properties of passive
superconducting (SC) microwave devices using a novel Laser Scan-
ning Microscope (LSM). In this technique, a modulated laser beam
is focused onto and scanned over the surface of a resonant SC de-
vice to probe the spatial distribution of rf current. The highly local-
ized photo-induced change of the kinetic inductance of the SC de-
vice produces both a shift of the resonant frequency 0 and change
of the quality factor . An image of these changes is recorded
as the laser spot is scanned over the device. We present the first
measurements of spatially resolved intermodulation response in a
High Temperature Superconducting (HTS) co-planar waveguide
resonator, opening up a new window into the local origins of non-
linearity in the HTS materials.
Index Terms--High- superconductors, intermodulation
distortion, laser scanning microscopy, microwave devices, nonlin-
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