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Software Fault Detection Using Dynamic Instrumentation George A. Reis David I. August
 

Summary: Software Fault Detection Using Dynamic Instrumentation
George A. Reis David I. August
Depts. of Electrical Engineering and Computer Science
Princeton University
{gareis,august}@princeton.edu
Shubhendu S. Mukherjee Robert Cohn
FACT and VSSAD Groups
Intel Massachusetts
{shubu.mukherjee,robert.cohn}@intel.com
Abstract
In recent decades, microprocessor performance has been
increasing exponentially. A large fraction of this perfor-
mance gain is directly due to smaller and faster transistors
enabled by improved fabrication technology. While such
transistors yield performance enhancements, their lower
threshold voltages and tighter noise margins make them
less reliable [1], rendering processors that use them more
susceptible to transient faults. Transient faults, also known
as soft errors, are intermittent faults caused by external
events, such as energetic particles striking the chip, that

  

Source: August, David - Department of Computer Science, Princeton University

 

Collections: Computer Technologies and Information Sciences