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Probabilistic Investigation of Sensitivities of Advanced Test-Analysis Model Correlation Methods
 

Summary: Probabilistic Investigation of Sensitivities of Advanced Test-Analysis
Model Correlation Methods
Elizabeth J. Bergman
Matthew S. Allen
Daniel C. Kammer
Department of Engineering Physics
University of Wisconsin
Madison, WI 53706
Randall L. Mayes
1
Sandia National Laboratories
PO Box 5800
Albuquerque, NM 87185
ABSTRACT
Correlation of test and analysis mode shapes using reduced Test Analysis Models (TAMs) has become an
industry standard method used to validate finite element models. Some organizations have even mandated
specific metrics regarding the allowable deviations in the orthogonality of mode shapes, using the TAM mass
matrix, that a model must meet to be considered valid. As a result, significant effort has been directed towards
developing robust TAMs and in comparing the robustness of the various approaches. The static or Guyan
reduction method has been touted as the most robust, although the evidence in the literature seems quite

  

Source: Allen, Matthew S. - Department of Engineering Physics, University of Wisconsin at Madison

 

Collections: Engineering