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1116 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 51, NO. 5, OCTOBER 2002 SBT Soft Fault Diagnosis in Analog Electronic
 

Summary: 1116 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 51, NO. 5, OCTOBER 2002
SBT Soft Fault Diagnosis in Analog Electronic
Circuits: A Sensitivity-Based Approach by
Randomized Algorithms
Cesare Alippi, Senior Member, IEEE, Marcantonio Catelani, Ada Fort, and Marco Mugnaini
Abstract--This paper addresses the fault diagnosis issue based
on a simulation before test philosophy in analog electronic circuits.
Diagnosis, obtained by comparing signatures measured at the
test nodes with those contained in a fault dictionary, allows for
sub-systems testing and fault isolation within the circuit. A novel
method for constructing the fault dictionary under the single
faulty component/unit hypothesis is proposed. The method, based
on a harmonic analysis, allows for selecting the most suitable test
input stimuli and nodes by means of a global sensitivity approach
efficiently carried out by randomized algorithms. Applicability
of the method to a wide class of circuits and its integration in
diagnosis tools are granted since randomized algorithms assure
that the selection problem can be effectively carried out with a
poly-time algorithm independently from the fault space, structure,
and complexity of the circuit.

  

Source: Alippi, Cesare - Dipartimento di Elettronica e Informazione, Politecnico di Milano

 

Collections: Computer Technologies and Information Sciences