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A Survey of Non-Raster Scan Methods with Application to Atomic Force Microscopy
 

Summary: A Survey of Non-Raster Scan Methods with Application to Atomic
Force Microscopy
Sean B. Andersson
Dept. of Aerospace and Mechanical Engineering
Boston University
Boston, MA 02215
sanderss@bu.edu
Daniel Y. Abramovitch
Agilent Laboratories
5301 Stevens Creek Blvd., M/S: 4U-SB
Santa Clara, CA 95051 USA
danny@agilent.com
Abstract-- Images in atomic force microscopy (AFM) are
built pixel-by-pixel through a raster scan process and can take
on the order of minutes to obtain. The problem of imaging
a sample can be characterized as using a short-range or
point-like sensor to obtain information about a system over
a region and is common across a broad range of fields in
science and engineering. In many cases, as in most AFM
images, the region to be scanned consists primarily of empty

  

Source: Andersson, Sean B. - Department of Aerospace and Mechanical Engineering, Boston University

 

Collections: Engineering