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A Test-Vector Generation Methodology for Crosstalk N oise Hamidreza Hashempour, Yong-Bin Kim, Naphill Park*
 

Summary: A Test- Vector Generation Methodology for Crosstalk N oise
Faults
Hamidreza Hashempour, Yong-Bin Kim, Naphill Park*
Department of Electrical and Computer Engineering, Northeastern University,
Department of Computer Science, Oklahoma State University*,
Email: hhashemp@ece.neu.edu, ybk@ece.neu.edu, npark@a.cs.okstate.edu
Abstract
This paper presents a new methodology to generate test vectors for crosstalk noise faults in deep
sub micron devices. The methodology includes transition activation on aggressor and constant as-
signment on victim, transition time estimation on aggressor, noise characterization on victim, and
propagating the noise to the primary outputs through the best paths. New approaches for transition
time estimation and noise activation are proposed based on logic cell characterization already avail-
able in design library and solving a satisfiability problem. It is shown that test generation efficienty
can be increased up to 18'!. and test generation time is decreased up to 3(!!..
1. Introduction
Recent advancesin integrated circuit design has shown that crosstalk issuesin deep sub micron
can causeseverevalidation and test problems. The continuous advancement in design has resulted
in high device densities, aggressiveclocking schemes,and small signal transition times. Based on
these design advancements, coupling effect between adjacent wires has become a very important
issue. It has been shown that if this phenomenon is not carefully considered during design and

  

Source: Ayers, Joseph - Marine Science Center & Department of Biology, Northeastern University

 

Collections: Engineering