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Summary: IEEE lnsrmmentation and Measurement
TechnologyConference
Vail, CO, USA, 20-22May 2W3
ENVIRONMENTAL BASED CHARACTERIZATION OF SoC FOR
STRATIFIED TESTING
N.-J. Park, K.M. George, N. Park
Dept. of ComputerScience
Oklahoma State University
Stillwater,OK, 74078-1053,USA
{nob, kmg, npark}@a.cs.okstate.edu
M. Choi
Dept. of Electrical and ComputerEngineering
University of Missouri-Rolla
Rolla, MO 65409-0040,USA
choim@umr.edu
Y.B. Kim, E Lombardi
Dept. of Electrical and Computer Engineering
NortheastemUniversity
Boston, MA 02115,USA
{ybk,lombardi}@ece.neu.edu
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