Home

About

Advanced Search

Browse by Discipline

Scientific Societies

E-print Alerts

Add E-prints

E-print Network
FAQHELPSITE MAPCONTACT US


  Advanced Search  

 
Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur
 

Summary: Soft x-ray emission spectroscopy studies of the electronic structure
of silicon supersaturated with sulfur
J. T. Sullivan,1,a)
R. G. Wilks,2
M. T. Winkler,1
L. Weinhardt,3
D. Recht,4
A. J. Said,4
B. K. Newman,1
Y. Zhang,5
M. Blum,5,6
S. Krause,5
W. L. Yang,6
C. Heske,5
M. J. Aziz,4
M. Bar,2,7
and T. Buonassisi1
1
Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge,
Massachusetts 02139, USA

  

Source: Aziz, Michael J.- School of Engineering and Applied Sciences, Harvard University

 

Collections: Physics; Materials Science