Summary: Soft x-ray emission spectroscopy studies of the electronic structure
of silicon supersaturated with sulfur
J. T. Sullivan,1,a)
R. G. Wilks,2
M. T. Winkler,1
L. Weinhardt,3
D. Recht,4
A. J. Said,4
B. K. Newman,1
Y. Zhang,5
M. Blum,5,6
S. Krause,5
W. L. Yang,6
C. Heske,5
M. J. Aziz,4
M. Ba¨r,2,7
and T. Buonassisi1
1
Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge,
Massachusetts 02139, USA

Source: Aziz, Michael J.- School of Engineering and Applied Sciences, Harvard University

Collections: Physics; Materials Science