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1676 Volume 55, Number 12, 2001 APPLIED SPECTROSCOPY0003-7028 / 01 / 5512-1676$2.00 / 0 q 2001 Society for Applied Spectroscopy
 

Summary: 1676 Volume 55, Number 12, 2001 APPLIED SPECTROSCOPY0003-7028 / 01 / 5512-1676$2.00 / 0
q 2001 Society for Applied Spectroscopy
Use of Near Edge X-ray Absorption Fine Structure
Spectromicroscopy to Characterize Multicomponent
Polymeric Systems
A. P. SMITH,* S. G. URQUHART, D. A. WINESETT, G. MITCHELL, and H. ADE
Departments of Physics (S.G.U., D.A.W., H.A.) and Materials Science and Engineering (A.P.S.), North Carolina State University,
Raleigh, North Carolina 27695; and Dow Chemical USA, Midland, Michigan 48667 (G.M.)
The merits of a polymer characterization technique, near edge X-
ray absorption ne structure (NEXAFS) spectromicroscopy, are
demonstrated through the characterization of a multilayer polymer
lm with partially unknown chemical composition. The combina-
tion of chemical speciation through NEXAFS spectroscopy with the
high spatial resolution available in X-ray microscopy allows the
characterization of polymeric materials not possible with conven-
tional techniques. Analysis of a multilayer with layers as thin as 4
m m has yielded results that differ from those previously obtained
by infrared microscopy. Layers below the spatial resolution limit of
infrared microscopy were characterized.
Index Headings: Near edge X-ray absorption ne structure spec-

  

Source: Ade, Harald W.- Department of Physics, North Carolina State University

 

Collections: Physics