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Summary: ForReview
Only
A Novel Adaptive Design Methodology for Minimum Leakage Power
Considering PVT Variations on Nanoscale VLSI Systems
Journal: IEEE Transactions on Very Large Scale Integration Systems
Manuscript ID: TVLSI-00189-2008
Manuscript Type: Special Issue Paper
Date Submitted by the
Author:
14-May-2008
Complete List of Authors: Kim, Kyung Ki; Northeastern University, ECE
Kim, Yong-Bin; Northeastern University, Electrical and Computer
Engineering
Key Words:
Leakage Power, Optimal VBody Control, Optimal VDD Control, PVT
Variations
http://www.princeton.edu/~tvlsi/
IEEE Transactions on Very Large Scale Integration Systems
ForReview
Only
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