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ESIM is a simulation tool that integrates logic fault and design error simulation for logic circuits. It targets several
 

Summary: 1
Abstract
ESIM is a simulation tool that integrates logic fault and
design error simulation for logic circuits. It targets several
design error and fault models, and uses a novel mix of sim-
ulation algorithms based on parallel-pattern evaluation,
multiple error activation, single fault propagation, and
critical path tracing. Several experiments are discussed to
demonstrate the power of ESIM.
1. Introduction
Fault simulation [3] consists of simulating a circuit's
behavior in the presence of faults. Comparing the faulty
response of the circuit to that of the fault-free response
using the same test set T, we can determine the faults
detected by T. Fault simulation has many applications, such
as test set evaluation, fault-oriented test generation, fault
dictionaries construction, and analysis of circuit operation
in the presence of faults. There are many algorithms for
fault simulation [3]: serial, parallel, deductive, concurrent,
parallel-pattern single-fault propagation [14], and critical

  

Source: Al-Asaad, Hussain - Department of Electrical and Computer Engineering, University of California, Davis

 

Collections: Computer Technologies and Information Sciences