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Summary: MACAU: A Markov Model for Reliability Evaluations of Caches Under Single-bit
and Multi-bit Upsets
Jinho Suh, Murali Annavaram and Michel Dubois
Ming Hsieh Department of Electrical Engineering
University of Southern California, Los Angeles
{jinhosuh, annavara}@usc.edu, dubois@paris.usc.edu
Abstract
Due to the growing trend that a Single Event Upset
(SEU) can cause spatial Multi-Bit Upsets (MBUs), the
effects of spatial MBUs has recently become an
important yet very challenging issue, especially in
large, last-level caches (LLCs) protected by protection
codes. In the presence of spatial MBUs, the strength of
the protection codes becomes a critical design issue.
Developing a reliability model that includes the
cumulative effects of overlapping SBUs, temporal
MBUs and spatial MBUs is a very challenging
problem, especially when protection codes are active.
In this paper, we introduce a new framework called
MACAU. MACAU is based on a Markov chain model
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