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Effects of microstructure on native oxide scale development and electrical characteristics of eutectic CuCu6La alloys
 

Summary: Effects of microstructure on native oxide scale development
and electrical characteristics of eutectic CuCu6La alloys
B.S. Senturk a
, Y. Liu a
, J.V. Mantese b
, S.P. Alpay a
, M. Aindow a,
a
Institute of Materials Science and Department of Chemical Materials and Biomolecular Engineering, University of Connecticut,
97 North Eagleville Road, Storrs, CT 06269-3136, USA
b
United Technologies Research Center, Silver Lane, East Hartford, CT 06108, USA
Received 25 May 2011; received in revised form 4 November 2011; accepted 6 November 2011
Abstract
A combination of electron microscopy, focused ion beam and conductive atomic force microscopy techniques have been used to study
the microstructure, oxide scale development, and electrical behavior of a Cu9 at.% La alloy. The as-cast alloy exhibits a eutectic micro-
structure comprising 30 vol.% Cu rods in a Cu6La matrix. The eutectic colonies exhibit a singular orientation relationship with [010]
Cu6La parallel to h011i Cu along the rod axis, and it is shown that this corresponds to lattice matching of the two phases along this
direction ($0.02% misfit). Oxidation of the alloy at 100 C to accelerate formation of a native oxide scale led to the development of
a Cu2O layer less than 25 nm thick on the Cu rods and a La-doped Cu2O scale up to 1 lm thick on the Cu6La matrix. The La-doped

  

Source: Alpay, S. Pamir - Department of Materials Science and Engineering, University of Connecticut

 

Collections: Materials Science