Summary: BulletProof: A Defect-Tolerant CMP Switch Architecture
Kypros Constantinides
Stephen Plaza
Jason Blome
Bin Zhang
Valeria Bertacco
Scott Mahlke
Todd Austin
Michael Orshansky

Advanced Computer Architecture Lab
Department of Electrical and Computer Engineering
University of Michigan University of Texas at Austin
Ann Arbor, MI 48109 Austin, TX, 78712
{kypros, splaza, jblome, valeria, bzhang@ece.utexas.edu
mahlke, austin}@umich.edu orshansky@mail.utexas.edu
Abstract
As silicon technologies move into the nanometer regime, tran-
sistor reliability is expected to wane as devices become subject
to extreme process variation, particle-induced transient errors,

Source: Austin, Todd M. - Department of Electrical Engineering and Computer Science, University of Michigan
Bertacco, Valeria - Department of Electrical Engineering and Computer Science, University of Michigan

Collections: Computer Technologies and Information Sciences; Engineering